Agilent Technologies B4655A FPGA Dynamic Probe

Agilent Technologies
B4655A FPGA Dynamic Probe
Data sheet
The Challenge
A Better Way
You rely on the insight a
logic analyzer provides to
understand the behavior of
your FPGA in the context of
the surrounding system. A
typical approach is to take
advantage of the programmability
of the FPGA to route internal
nodes to a small number of
physical pins that a logic
analyzer can measure. While
this is a very useful approach,
it has significant limitations.
Collaborative development
between Agilent and Xilinx
have produced a faster and more
effective way to use your logic
analyzer to debug FPGAs and the
surrounding system. The Agilent
FPGA dynamic probe, used in
conjunction with an Agilent logic
analyzer, provides the most
effective solution for simple
through complex debugging.
• Since pins on the FPGA
are typically an expensive
resource, there are a relatively
small number available for
debug. This limits internal
visibility (i.e. one pin is
required for each internal
signal to be probed).
• When different internal
signals need to be accessed
you must change your design
to route these signals to pins.
This can be time consuming
and can affect the timing of
the FPGA design.
• Finally, the process required
to map the signal names from
the FPGA design to the logic
analyzer setup is manual and
tedious. When new signals
are routed out, the need to
manually update these signal
names on the logic analyzer
takes additional time and is
a potential source of
confusing errors.
Debug your FPGAs faster and more
effectively with a logic analyzer
The Agilent FPGA dynamic probe,
used in conjunction with an
Agilent logic analyzer, provides
the most effective solution for
debugging problems [simple
through complex]. The FPGA
dynamic probe lets you:
• Make multiple measurements
in seconds — Moving probe
points internal to an FPGA
used to be time consuming.
Now, in less than a second you
can easily measure a different
set of internal signals —
without design changes. FPGA
timing stays constant when
you select new sets of internal
signals for probing.
SW application supported
by 1680, 1690, 16800 and
16900 Series logic analyzers
PC board
Insert ATC2 core with
Xilinx Core Inserter
or EDK
or USB
Xilinx cable
Figure 2. Create a timesaving FPGA measurement system. Insert an ATC2 (Agilent Trace
Core) core into your FPGA design. With the application running on your logic analyzer
you control which group of internal signals to measure via JTAG.
Selection MUX
• Leverage the work you did in
your design environment —
The FPGA dynamic probe is
the industry’s first tool that
maps internal signal names
from your FPGA design tool
to your logic analyzer.
Eliminate unintentional
mistakes and save hours of
time with this automatic
setup of signal and bus
names on your logic analyzer.
Probe outputs
on FPGA pins
To FPGA pins
• View internal activity —
With a logic analyzer, you are
normally limited to measuring
signals at the periphery of the
FPGA. With the FPGA dynamic
probe, you can now access
signals internal to the FPGA.
You can measure up to 128
internal signals for each
external pin dedicated to
debug, unlocking visibility into
your design than you never
had before.
Figure 1. The FPGA dynamic
probe application endows your
logic analyzer with unique
productivity enhancements to
find problems more quickly.
Change signal bank
selection via JTAG
Figure 3. Access up to 128 internal signals for each debug pin. Select cores with 1, 2, 4,
8, 16, 32, or 64 signal banks. Signal banks all have identical width (4 to 128 signals
wide) determined by the number of pins you devote for debug. Each pin provides
sequential access to 1 signal on every input bank. Using an optional 2X time division
compression in state mode, each pin can access 2 signals per bank.
A quick tour of the application
Design step 1: Create the ATC2 core
Use Xilinx Core Inserter or EDK
to select your ATC2 parameters
and to create a debug core that
best matches your development
needs. Parameters include
number of pins, number of signal
banks, the type of measurement
(state or timing), and other ATC2
Design step 2: Select groups of
signals to probe
Specify banks of internal signals
that are potential candidates for
logic analysis measurements
(using Xilinx Core Inserter
or EDK).
Activate FPGA Dynamic Probe
The FPGA dynamic probe icon
allows you to control the
ATC2 Core and setup the
logic analyzer.
Measurement setup step 1:
Establish a connection between
the analyzer and the ATC2 core
The FPGA dynamic probe
application establishes a
connection between the logic
analyzer and a Xilinx cable.
It also determines what devices
are on the JTAG scan chain and
lets you pick which one you wish
to communicate. Core and device
names are user definable.
Measurement setup step 2:
Map FPGA pins
Quickly specify how the FPGA
pins (the signal outputs of
ATC2) are connected to your
logic analyzer. Select your probe
type and rapidly provide the
information needed for the logic
analyzer to automatically track
names of signals routed through
the ATC2 core.
For ATC2 cores with auto setup
enabled, each pin of the ATC2
core, one at a time, produces a
unique stimulus pattern. The
instrument looks for this unique
pattern on any of its acquisition
channels. When the instrument
finds the pattern, it associates
that instrument channel with the
ATC2 output pin producing it. It
then repeats the process for each
of the remaining output pins
eliminating the need to manually
enter probe layout information.
Measurement setup step 3:
Import signal names
Tired of manually entering bus
and signal names on your logic
analyzer? The FPGA dynamic
probe application reads a .cdc file
produced by Xilinx Core Inserter.
The names of signals you measure
will now automatically show on
your logic analysis interface.
Setup Complete: Make measurements
Quickly change which signal bank
is routed to the logic analyzer. A
single mouse click tells the ATC2
core to switch to the newly
specified signal bank without any
impact to the timing of your
design. To make measurements
throughout your FPGA, change
signal banks as often as needed.
User-definable signal bank names
make it straight forward to select
a part of your design to measure.
Correlate internal FPGA activity with
external measurements
With each new selection of a
signal bank, the application
updates new signal names from
your design to the logic analyzer.
View internal FPGA activity and
time correlate internal FPGA
measurements with external
events in the surrounding system.
Using the FPGA Dynamic probe,
each pin provides access to up to
128 internal signals. The number
of debug pins can range from 4
to 128 depending on your needs.
When using synchronous cores,
one additional pin is used for
the clock.
with external
New internal
FPGA probe
points and
signal names
Number of debug pins
Maximum internal signals
Agilent B4655A specifications and characteristics
Supported logic analyzers
Standalone logic analyzers
1680 Series, 1690 Series, 16800 Series
Modular logic analysis systems
16900A, 16902A, 16903A with one or more state/timing modules:
A single node-locked FPGA dynamic probe license will enable all
modules within a 16900 Series system
Triggering capabilities
Determined by logic analyzer
Supported Xilinx FPGA families
Virtex-5, Virtex-4, Virtex-II Pro series, Virtex-II series, Spartan-3 series
Supported Xilinx cables (required)
Parallel 3 and 4, Platform Cable USB
Supported probing mechanisms
Soft touch (34-channel and 17-channel), Mictor, Samtec, Flying lead
FPGA dynamic probe software application
Maximum number of devices supported on a JTAG scan chain
Maximum number of ATC2 cores supported per FPGA device
Agilent trace core characteristics
Number of output signals
User definable: Clock line plus 4 to 128 signals in 1 signal increments
Signal banks
User definable: 1, 2, 4, 8, 16, 32, or 64
State (synchronous) or timing (asynchronous) mode
Optional 2X compression in state mode via time division multiplexing.
Logic analyzer decompresses the data stream to allow for full
triggering and measurement capability.
FPGA Resource consumption
Approximately 1 slice required per input signal to ATC2 Core
Consumes no BUFGs, DCM or Block RAM resources.
See resource calculator at
Compatible design tools
ChipScope Pro Version
1680, 1690, 16800, 16900 Series SW Version
Primary New Features
6.2i, 6.3i
2.5 or higher
Mouse-click bank select, graphical pin mapping,
.cdc signal name import
6.2i, 6.3i
3.0 or higher
Support for Virtex-4 devices, improved JTAG drivers,
single-session multi-core support, user-definable naming
3.2 or higher
Plug & run (auto pin mapping), ATC2 “always on” option,
ATC2 width + 64 banks, Platform Cable USB support,
PRBS stimulus on test bank
3.5 or higher
Support for Virtex-5, 16800 Series
EDK (Embedded Development Kit)
8.1i SP2
3.2 or higher
Support for ATC2 core using EDK flow
Core Inserter produces ATC2 cores post-synthesis (pre-place and
route) making the cores synthesis independent.
ATC2 cores produced by Core Generator are compatible with:
• Exemplar Leonardo Spectrum
• Synopsys Design Compiler
• Synopsys Design Compiler II
• Synopsys FPGA Express
• Synplicity Synplify
• Xilinx XST
Additional information available via the Internet ( and
Ordering information
Related Literature
Ordering options for the Agilent
B4655A FPGA dynamic probe:
Publication Title
Publication Type
Publication Number
Agilent Technologies 16900 Series
Logic Analysis Systems
Color Brochure
Agilent Technologies Timing and
State Modules for the 16900 Series
Data Sheet
Probing Solutions for Agilent Technologies
Logic Analyzers
Agilent 16800 Series Logic Analyzers
Color Brochure
Option 012
Agilent 16800 Series Logic Analyzers
Data Sheet
• Entitlement certificate for
perpetual floating license
Agilent 1680 and 1690 Series
Logic Analyzers
Data Sheet
• CD with application software
FPGA Dynamic Probe
Data Sheet
Option 011
• Entitlement certificate for
perpetual node-locked license
• CD with application software
For copies of this literature, contact your Agilent representative or visit
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Product specifications and descriptions in this
document subject to change without notice.
© Agilent Technologies, Inc. 2006
Printed in USA, May 31, 2006