Agilent RDX Test Solutions for DigRF v3 and v4

Agilent RDX Test Solutions for
DigRF v3 and v4
N5343A DigRF Exerciser Module
N5344A DigRF Analyzer Module
Data Sheet
• Easily debug and
integrate your DigRF
based RF-IC and
BB-IC components
• Get insight from bit
level to IQ modulated
RF signals
• Get the greatest
confidence on your
mobile handset
design from turn-on
through integration
N5343A and N5344A Analyzer and Exerciser for DigRF v3 and v4
Combine custom
stimulus generation
and real-time analysis
to diagnose and
characterize your system
faster
Applications
Key features
• DigRF v4 link turn-on and debug
• Real time DigRF stimulus and
analysis
• RF-IC prototype turn-on and
characterization
• BB-IC prototype turn-on and signal
processing software development
• RF-IC and BB-IC integration and
troubleshooting
• Supports both DigRF v3 and v4
specifications
• Low intrusion probing solutions
ensure DigRF measurement
reliability
• Bit level to modulation level
measurements for RF and Digital
Design teams
• Automated test
• Robustness test with error
injection
• For RF-IC test, the exerciser
simulates a BB-IC
• For BB-IC test, the exerciser
simulates a RF-IC
• Supports 1x and 2x link width
• Allows multiple errors insertion
• Rich triggering Support
• Based on modular, scalable
platform
2
N5343A and N5344A Analyzer and Exerciser for DigRF v3 and v4
DigRF v4 is rapidly emerging as the
next-generation serial interface
between mobile baseband and
RF chips. It is designed for use in
high bandwidth mobile systems
incorporating air interface standards
such as LTE and WiMAX.
Engineers traditionally use spectrum
analyzers to perform modulation
measurement from an analog IQ link
between the BB-IC and the RF-IC, but
need new tools to perform similar
measurement on the DigRF digital
serial interface.
The DigRF standard presents
several new challenges for mobile
wireless development, integration
and validation teams as the
communication link between the
BB ICs and the RF-ICs evolve from
analog to high speed serial digital.
To validate RF-IC operation before
the start of the handset integration
phase, engineering teams need DigRF
digital serial stimulus and analysis
tools that operate in concert with the
traditional RF tools.
One of the main challenges is that all
components may not be available or
ready during the tests. For example,
the RF-IC needs to be tested without
the BB-IC and vice versa.
To reproduce system problems or
run regression tests, you often need
to create traffic conditions that may
be difficult to reproduce with real
devices.
RF design team challenge
Digital IQ data and control
information are packetized and
transferred between the BB-IC and
the RF-IC over the DigRF interface.
The challenges for BB-IC validation
teams mirrors that of the RF-IC
teams, as the signal sources and
spectrum analyzers must be replaced
by DigRF digital serial stimulus and
analysis tools to validate BB-IC
functionality.
Integration challenges
During the integration phase, it
becomes challenging to find the
root cause of interoperability issues,
that may reside in the digital or
RF domains. Digital and RF design
teams need a common platform that
provides insight in the domain of
their choice.
Now you can get the capabilities
you need with the Agilent RDX
N5344A and N5345A DigRF test
solution, providing protocol debug
and enabling comprehensive
cross-domain test for RF-IC and
BB-IC developers and integration
teams.
This solution includes a probing
technology with minimum intrusion
to maximize measurement reliability.
Digital design team challenge
To ensure that your design operates
according to the DigRF protocol
specification, it is important to get
insight on the DigRF v4 link and
protocol state machines and verify
that the packet’s structure are
compliant with the standard, and to
be able to detect error conditions.
3
It utilizes Agilent’s vector signal
generation and analysis software,
providing insight from bit level
to complex IQ modulation level
necessary to enable RF and digital
engineers to quickly characterize
RF-ICs and solve cross domain
problems.
N5343A and N5344A Analyzer and Exerciser for DigRF v3 and v4
A single platform for both
digital and wireless design
teams
The test solution allows engineers to work in the domain (Digital or RF) of
their choice to quickly characterize the DUT’s digital and wireless behavior and
rapidly solve cross-domain integration problems.
Digital
Domain
Wireless
Domain
Signal Analyzer
Product structure
Wireless Physical
Layer Validation
Signal Source
DigRF Tester
DigRF v4
Digital Protocol Layer
Debug/Validation
DigRF Tester
The DigRF test solution consists of:
• Windows® XP based controller with host software
• N5540A N2X 2-slot chassis with LAN connection to host
• N5343A DigRF exerciser module
• N5344A DigRF analyzer module
• N5345A and N5346A probing solutions
Both modules can be used separately or together for a high performance
measurement solution.
4
N5343A and N5344A Analyzer and Exerciser for DigRF v3 and v4
Probing solutions
The N5344A Analyzer module can be connected to the target system through
a N5343A high-speed soft touch probe or a N5344A flying lead probe for signal
access to space constrained devices.
Software structure
The same hardware modules can be controlled through several user interfaces,
providing protocol level stimulus and analysis and modulation level stimulus
and analysis.
Signal
Generation
Software
(ADS, Signal Studio)
DigRF
Exerciser
GUI
DigRF
Analyzer
GUI
Signal
Inserter
Signal
Analysis
Software
(VSA)
Signal
Extractor
Agilent
N5343A
Exerciser
Module
5
Agilent
N5344A
Analysis
Module
Typical Test Configurations
Active DigRF bus test
configuration
In this configuration, the N5343A Exerciser module emulates a DigRF device
connected to the device under test.
It can emulate either a BB-IC or an RF-IC, depending of the nature of the device
under test.
The N5343A can exercise either a DigRF V3 or a DigRF v4 bus.
When more analysis performance is required, the N5344A DigRF analyzer
module can be combined with the N5343A.
RF-IC
or BB-IC
DUT
DigRF v4/v3
N5543A DigRF Exerciser Module
N5544A DigRF Analyzer Module
(optional)
Passive DigRF test
configuration
In this configuration, the N5544A Analyzer module transparently captures
traffic between two devices.
This configuration is used during the integration phase to trouble shoot the link
and solve cross domain issues.
DigRF v4/v3
BB-IC
RF-IC
Device under test
N5545A/46A
Probe
N5544A DigRF Analyzer Module
6
Typical Test Configurations
RF-IC test configuration
In this configuration, the N5543A Exerciser module is combined with an RF
signal generator and an analyzer, to provide stimulus and analysis on the RF
interface.
The same signal generation software and signal analysis software can be used
to build stimulus and analyze data on both DigRF and antenna sides of the
RF-IC.
RF-IC
or BB-IC
DUT
DigRF v4/v3
N5543A DigRF Exerciser Module
N5544A DigRF Analyzer Module
(optional)
7
N5343A and N5344A Analyzer and Exerciser for DigRF v3 and v4
Use familiar software
tools in both digital
and wireless domains
through the entire design
cycle.
At any time, you can decide to work in the domain (digital or RF) and the
abstraction level (physical or protocol) to quickly characterize the device under
test and solve cross domain integration problems.
If you are a digital design engineer, the digital user interface provides you the
features to stimulate the DigRF interface at the link and protocol layer, and
observe the system behavior will full packet decoding capabilities.
If you are an RF design engineer, you will use the same familiar signal
generation (Agilent Signal Studio or ADS) and analysis tools (Agilent VSA)
with your signal analyzer, signal sources and DigRF analyzer/exerciser and get
consistent measurements across both digital and analog interfaces of your
RF-IC.
8
Digital Domain User Interface
Fully test your design’s DigRF link and
protocol interface
• Configurable DigRF v3 and v4
traffic generation
• Customize header and payload,
and frame sequence generation
• Repetitive and loop events
• Control and data traffic generation
• Low power and high speed mode
control
• Error insertion to validate device’s
robustness and error recovery
Hierarchical trace display speeds your
debug process
Packet view of DigRF traffic
• Avoid constant scrolling with the
hierarchical display that maximizes
information density on the screen
• Full decoding capabilities
• Track mode changes
• Compare frames details and easily
find bit-level differences
• Easily retrieve information with
embedded markers
• Quickly find problems with
automatic error detection
Powerful triggering, easy setup
• Easy trigger setup by using and
editing predefined patterns
Easily configure traffic and insert errors
9
Wireless Domain Software Tools
Use familiar tools to create
Digital IQ stimulus and easily
embed it into DigRF traffic
Digital IQ data can be loaded into the
Exerciser from a variety of sources,
including Signal Studio and Advanced
Design System (ADS). The IQ data
is encapsulated into DigRF v3 or
v4-compliant packets.
The data packets are transferred to
the device under test with the proper
timing by the exerciser module.
Control packets, as specified by the
user, can be inserted into the data
packet flow while looping through
the waveform. With this feature, you
can make configuration adjustments
– like the gain setting of the RF
amplifiers – interactively.
Use familiar tools to perform
modulation measurement from
received DigRF traffic
The N5543A acquisition module
captures the traffic from the device
under test. The data packets are
identified and the digital IQ data is
automatically extracted from these
packets using the signal extractor
tool. The digital IQ data is analyzed
by the 89601A vector signal analysis
tools running on the host controller.
These capabilities enable RF-IC or
BB-IC validation team to validate that
the digital IQ was properly converted
to DigRF format. In addition, the DSP
algorithms that generated the IQ can
be evaluated.
10
Agilent N5343A Exerciser Module Features and Specifications
The N5343A exerciser can support both DigRF v3 and DigRF v4 standards
DigRF v3 specifications
Connectors
SMA
Dedicated IO pins for v3 and v4
Yes
Performance specifications
Line rate
312 Mbps
Transmitter electrical characteristics
SysClk speed support
19.2 MHz, 26 MHz, 38.4 MHz
Sequencer control
Loops
Yes
Conditional branches
Yes
Timer delay between packets
Yes
Error injection
Wrong CRC
Wrong framing
GPIO bus
A 36 pin width GPIO bus can be used for stimulus of proprietary interface
Error counters
Number of CRC errors
Number of received frames
Capture buffer
Buffer size
From 512 MBytes, 1 Gbyte with option 1GM
Trigger conditions
8
11
Agilent N5343A Exerciser Module Features and Specifications
DigRF v4 specifications
Connectors
SMA
Lanes
The exerciser supports a full line with two TX and two RX lines
Dedicated IO pins for v3 and v4
Yes
Performance specifications
Line rate
1248 Mbps/1456 Mbps
Sequencer control
Loops
Yes
Conditional branches
Yes
Timer delay between packets
Yes
Error injection
Wrong CRC
Wrong CRI
Disparity error
Code error
Wrong framing
Missing ACK/NAK
Loss of frame
GPIO bus
A 36 pin width GPIO bus can be used for stimulus of proprietary interface
Error counters
Number of CRI errors
Number of CRC errors
Number of frame length errors
Number of received frames
Capture buffer
Buffer size
From 512 MBytes; 1GByte with option 1GM
Trigger conditions
Operating system
Windows XP Service Pack 3
12
Agilent N5344A Analyzer Module Specifications
The N5344A analyzer can support both DigRF v3 and DigRF v4 standards
General specifications
Connectors
Probe
Agilent soft touch (N5345A) and flying leads (N5346A)
External RefClock output
SMA
Trigger In/Out
Trigger analyzer from external source
Trigger output from internal event
Dedicated IO pins for v3 and v4
Yes
13
Agilent N5344A Analyzer Module Specifications
DigRF v3 specifications
Performance specifications
Line rate
Up to 312 Mbps
SysClk speed
19.2 MHz, 26 MHz, 38.4 MHz
Trace depth
1 Gbyte extensible to 2 Gbytes with option 2GM
Triggering capabilities
Pattern matcher
8
Errors detection
Wrong CRC
Wrong framing
Storage qualification
Yes
Analyzer capabilities
Analyze both Tx and Rx
Yes
Mode transitions tracking
All mode transitions as defined by the DigRF specification
Displaying capabilities
Protocol decode
All DigRF packets as defined by the specification
IQ data extraction
The analyzer is able to extract the IQ data from the DigRF data stream.
The data can be viewed inside the protocol analyzer software with the
waveform viewer. In addition, the IQ can be evaluated using the 89600
VSA software.
14
Agilent N5344A Analyzer Module Specifications
DigRF v4 specifications
Connectors
Probe
Agilent soft touch (N5345A) and flying leads (N5346A)
External RefClock output
SMA
Trigger In/Out
Trigger analyzer from external source
Trigger output from internal event
Lanes
The exerciser supports a full line with two TX and two RX lines
Dedicated IO pins for v3 and v4
Yes
Performance specifications
Line rate
1248 Mbps/1456 Mbps
SysClk speed
26 MHz, 38.4 MHz, 56 MHz
Trace depth
1 Gbyte extensible to 2 Gbytes with option 2GM
Triggering capabilities
Pattern matcher
8
Errors detection
Invalid Sync Word
Wrong CRC
Wrong CRI
Disparity error
Code error
Wrong framing
Errors with missing ACK/NAK
Storage qualification
Yes
Analyzer capabilities
Analyze both Tx and Rx
Yes
Mode transitions tracking
All mode transitions as defined by the DigRF specification
Timestamp resolution
V4 protocol items
HS burst
Sys burst
TAS messages
Nested frames
ACK/NACK
Displaying capabilities
Protocol decode
All DigRF packets as defined by the specification
IQ data extraction
The analyzer is able to extract the IQ data from the DigRF data stream.
The data can be viewed inside the protocol analyzer software with the
waveform viewer. In addition, the IQ can be evaluated using the 89600
VSA software.
Operating system
Windows XP Service Pack xxx
15
Agilent N5344A Analyzer Module Specifications
Environment
Module requirements
Temperature (AT-ETM757)
Operating: 0 °C to +55 °C
Storage: –40 °C to +70 °C
Humidity (AT-ETM758)
Operating: 15 to 95%
Operating soak: 90% (24 h)
Safety standards
Installation category: EN ISO/IEC 17025, IEC 61010-1/EN61010-1, II
Pollution degree: 2
Environmental rating: Standard
Chassis requirements
Temperature (AT-ETM757)
Operating: 0 °C to +55 °C
Storage: –40 °C to +70 °C
Humidity (AT-ETM758)
Operating: 15 to 95%
Operating soak: 90% (24 h)
Safety standards
Installation category: EN ISO/IEC 17025, IEC 61010-1/EN61010-1, II
Pollution degree: 2
Environmental rating: Standard
General characteristics
Power requirements
100-120 Vac, 200-250 Vac
550 VA maximum
47 to 63 Hz
Physical characteristics
2-slot chassis
Width: 30 cm (11.81 in)
Depth: 49.0 cm (19.29 in)
Height: 11 cm (4.33 in)
Weight (empty): 5.1 kg (11.2 lbs)
16
How to Configure a System
The recommended configuration
consists of a Windows XP-based
system controller (desktop PC
or laptop) with one LAN 10/100
network card dedicated to the
connection to one chassis containing
at least one N5343A exerciser or
N5344A analyzer module.
System controller
The system controller is loaded
with the software that provides a
graphical interface to drive protocols
and applications running on the test
cards. The system controller must
include a LAN card dedicated to the
connection to the test chassis.
Chassis
The chassis can be a 2-slot N2X
chassis or 4-slot N2X chassis,
connected to the system controller
through a LAN interface.
Test modules
The configuration may include a
N5343A DigRF exerciser module, a
N5344A DigRF analyzer module, or
both.
The Agilent N5343A module is
connected to the target system
through SMA cables (not included).
When used alone, the N5344A analyzer module requires a probing solution
(N5345A soft touch or N5346A flying lead ) for connection to the target system.
When used in conjunction with A N5343A exerciser module, the N5344A
analysis module receives the DUT’s information directly from the exerciser
through a bridge cable, and therefore does not require an external probing
solution.
Each test module must be licensed to support DigRF v3 or v4 for specific traffic
generation and analysis.
Agilent product number
Description
Chassis
N5540A
2-slot, 2U high chassis
N5541A
4-slot, 2U high chassis
Test cards
N5343A
DigRF Exerciser module
Option 1GM
Increase to 1 Gbyte memory for exerciser
Option V3E
DigRF v3 Stimulus License
Option V4E
DigRF v4 Stimulus License
Option V3A
DigRF v3 Capture License
Option V4A
DigRF v4 Capture License
N5344A
DigRF Analyzer module
Option 2GM
Increase to 2 Gbyte memory for analyzer
Option V3A
DigRF v3 Capture License
Option V4A
DigRF v4 Capture License
Probes
N5345A
Soft touch mid bus probe
N5346A
Flying leads
17
How to Configure a System
Software
Each module’s license includes the
digital interface software package.
For example, the option V3E of the
module N5343A includes the digital
exerciser software.
Agilent product number
Description
Upgrade kits
N5343U
Upgrade kit for DigRF exerciser module
Option 1GM
Increase to 1 Gbyte memory for exerciser
Option V3E
DigRF v3 Stimulus License
Option V4E
DigRF v4 Stimulus License
The wireless software applications,
such as VSA, Signal Studio or ADS
software, must be ordered separately.
Option V3A
DigRF v3 Capture License
Option V4A
DigRF v4 Capture License
N534UA
Upgrade kit for DigRF analyzer module
Upgrades
Option 2GM
Increase to 2 Gbyte memory for analyzer
Option V3A
DigRF v3 Capture License
Option V4A
DigRF v4 Capture License
Modules ordered with some licenses
may be upgraded later with additional
licenses. For example, an exerciser
module that has been ordered with
the V3E license (to operate with a
DigRF v3 target), can be upgraded to
operate with a DigRF v4 target, by
adding the V4E license.
18
Related Agilent Literature
Publication title
Pub number
Agilent N2X Chassis Data Sheet
5989-1531EN
Agilent DigRF Brochure
5989-9400EN
19
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Revised: August 14, 2008
Product specifications and
descriptions in this document
subject to change without notice.
© Agilent Technologies, Inc. 2009
Printed in USA, January 15, 2009
5989-9575EN