TA720 Time Interval Analyzer - Yokogawa Electric Corporation

High Speed
Continuous Measurement at up to 80 MS/s
Time Interval Analyzer
TA720
Maximum Continuous Sampling Rate 80 MS/s
Dual Measurement Function
Inter-Symbol Interference Analysis Function, Built-in Printer, and GP-IB Interface are all standard features
Ethernet and PC Card Interface (optional)
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Bulletin 7045-00E
A new, High-Speed, Multifunction Addition to the TA Series
Continuous Measurement at up to 80 MS/s and Inter-Symbol Interference Analysis with Dual Measurement Function
The TA720 Time Interval Analyzer has larger memory capacity and is faster than the highly regarded TA520 and TA320. It
has a maximum sampling rate of 80 MS/s, and maximum memory capacity of 1024 k samples (in Time stamp mode). In
addition, the TA720 has a variety of completely new functions, such as a dual measurement function, inter-symbol
interference analysis function, and an optional Ethernet and PC card interface. This time interval analyzer is the ideal
analysis tool for jitter analysis of high-speed optical disk signals and recording characteristic evaluations.
Built-in printer
3.5-inch floppy drive
Input channels A/B
TFT color LCD screen
(CHB phase setting
function included)
(backlight can be
turned ON/OFF)
External arming input,
Inhibit input
● High-Speed Continuous Measurement at up to 80 MS/s
The TA720 can continuously measure signals as fast as eight times DVD speed. It continuously measures high-speed
signals from sources such as fast-rotating CDs and DVDs, and next-generation optical disks without dropping
measurements. This makes accurate jitter analysis possible.
● Dual Measurement Function
This function enables two measurements to be done simultaneously. The available measurement combinations are Period
A & Period B, Period A & A-to-B time interval, Pulse A & Pulse B, and Pulse A & A-to-B time interval. During optical disk
jitter measurement, for example, it is possible to perform two types of jitter measurements (data-data jitter and data-clock
jitter).
● Inter-Symbol Interference Analysis Function
With this function, it is possible to extract and analyze data corresponding to set code conditions (such as all T spaces
between 3T marks). The distribution of the extracted data and related statistics can also be displayed and compared
against all of the data at the same time. When combined with the dual measurement function, the inter-symbol
interference analysis function enables even faster jitter analysis through techniques such as extracting data-clock data
using pulse width as a condition.
● Ethernet and PC Card Interface (optional)
Data transmitted to the TA720 through an Ethernet connection can be saved to the PC card or shared over a network. In
addition, measurement conditions can be set and controls such as starting and stopping measurements can be entered
over the network when an Ethernet connection is used.
High-Speed (80 MS/s) Continuous Measurement
The TA720 contains multiple counter circuits with 25 ps resolution. When these circuits are switched at high speed, the
TA720 is capable of time measurement at up to 80 MS/s (12.5 ns period; see below). For example, the TA720 can
continuously measure 1-7 modulation signals without dropping data, if the minimum 2T pulse width is 12.5 ns or greater.
(Note: This does not apply during dual measurement function)
25 ps
resolution counter
The TA720 contains multiple 25 ps
resolution counter circuits. These circuits
can be sequentially switched at up to 80
MS/s for continuous measurement.
25 ps
resolution counter
Internal
memory
25 ps
resolution counter
Internal
memory
Continuous measurement requirement:
Minimum pulse width greater than 12.5 ns (= 80 MS/s)
Data signal
CPU
25 ps
resolution counter
2
Clock signal
Display
Measurement Measurement Measurement
Meeting the Needs of Developers in the Optical Disk Market
The TA720 has a variety of functions that are useful in optical disk jitter measurements. These functions can be combined for
even greater efficiency in jitter measurements.
■ Dual Measurement Function
Simultaneous Measurement of Data-Data Jitter and Data-Clock Jitter
The dual measurement function can be used to simultaneously
measure an optical disk’s data-data jitter and data-clock jitter. In the
past, it was necessary to do these measurements separately, so there
was a need for steps such as synchronization using an index signal
from a spindle motor as a measurement-start control signal. With the
TA720, however, these two measurements can be done simultaneously,
so data-data jitter and data-clock jitter from the same measurement
area are obtained at the same time.
■ Inter-Symbol Interference Analysis Function
This function extracts data corresponding to specified conditions, such
as jitter for each space length immediately following a 3T mark, and
jitter in each space length between one 3T mark and another. This data
can be used to analyze the effects of the code on jitter.
The inter-symbol interference analysis function is useful for evaluating
recording strategies, such as recording power control and phase
control, and recording waveforms. The distribution of the extracted data
and related statistics can also be displayed and compared against all of
the data at the same time.
Code length settings that can be selected include arbitrary code length
(nT), length shorter than a specified code (nT>), and length longer than
a specified code (nT<). With these settings, for example, it is possible to
measure jitter for each space length immediately following marks which
are 6T or longer, and jitter following long recording lengths.
Example of simultaneous measurement of pulse width
and data-clock jitter
Examples of Pulse Width Data Extraction
Example of jitter measurement for each space length
between 3T marks
Single
Combination
Extract data immediately before or immediately
after a specified code length.
Specified
code
Extracted
Between
Specify consecutive code and extract data
immediately preceding or following them.
Specified
code
Specify codes preceding and following the
data to be extracted.
Specified Extracted
code
Specified
code
Extracted
Specified
code
Data-Clock Time Difference Jitter Analysis Based on Recording Length
Using the Dual Measurement Function and Inter-Symbol Interference Analysis Function in Combination
The inter-symbol interference analysis function can be used in combination with the dual measurement function (Pulse A
& A-to-B time interval) to extract data-clock time difference data at each recording length (pulse width).
Examples of data-clock data extraction in case of EFM+ data.
Data-Clock Data Immediately Following 3T
3TM
3TM
Extracted
Data-Clock Data Immediately Following 4-14T
3TM
Extracted
3TM
Extracted
Data-Clock Data Excluding 3T Marks and Spaces
3TM
Extracted
3TS
Extracted
Extracted
3
■ Simultaneous Display of Pulse Width Bipolarity
The TA720 can simultaneously display
histograms and statistics for both the positive
and negative pulse widths. Numerical individual
jitter values, distributions (difference between
average value and ideal value for each pulse
width), and the like can be checked while
comparing the positive and negative histograms.
In addition, it is possible to display bipolar
histograms and statistics.
Pulse width (positive)
histogram
Pulse width (negative)
histogram
List of statistics for
positive and negative
pulse widths
■ Multi-Window Function
This function allows you preset up to 14 windows for
simultaneous analysis and display of histograms and
statistics in those windows. During dual measurement
function, data-data and data-clock histograms and statistics
can be displayed at the same time. In cases where the CAV
control is used and the data rate changes according to disk
position, the auto-window function is useful for automatically
adjusting the window setting. This function provides an
Estimated T method, in which the clock period is estimated
from the average data signal value; and a Measured T
method, in which the clock period is measured from the CHB
input signal. The clock period is measured to automatically
adjust the window position.
Example of multi-window screen
Simultaneous display of data-data and data-clock histograms
Example of multi-window setting screen
■ External Synchronization Auxiliary Input
For Measuring just the Data Part or just the Header Part on and Optical Disk
The TA720 has the following functions for synchronization with the exterior:
• External Arming
• External Gate (connector shared with external arming)
• Inhibit
The inhibit and external arming functions can be used to separate the data part from the header part during jitter
measurement. In addition, a block sampling function can be used to divide the internal memory into as many as 1000
blocks (250 blocks during time stamp mode) for data acquisition. In cases where the recording area is small, such as
during media material evaluations, the block sampling function can be used to accumulate samples by performing multiple
block measurements with a small amount of data in each measurement (block).
Example of Combined Use of External Arming and Block Sampling Functions
External arming signal
Arming delay
Block 1
Measurement period during block sampling
Block 2
Measurement inhibition period based
on inhibit signal
Measured signal
Actual measurement periods
4
Measurement
Measurement
Measurement
Measurement
■ TA720 Screen Displays for Various Types of Analysis
Histogram Display (Half Size)
List Display
When the histogram is set to half size, the statistics
display is enlarged.
During time stamp mode, the individual measurement
values and the time elapsed from the start of
measurement are displayed. The graph is displayed at
the same time so detailed data can be checked while
viewing the broader trend.
Statistics Display
Time Variation Display (Dual Measurement
Example Shown)
During bipolar pulse width measurement, statistics for
both positive and negative pulse widths are displayed
at the same time.
This display can be used to display and analyze trends
in measurement values over time. During dual
measurement, it is possible to separately display data
trends for two measurement functions.
Symbol Search Function
Jitter and Deviation Graph Display
In time stamp mode or inter-symbol interference
analysis mode, as many as four consecutive symbols
(recording length nT) can be specified to search for
data matching the symbol conditions.
In this type of display, a histogram display is shown on
top, and a jitter graph, deviation graph, or statistics list
(selected by user) is displayed on the bottom. This type
of display is useful for evaluating trends for each
recording length nT on an optical disk.
Rear Panel
● Ethernet and PC Card Interface (optional)
● GP-IB Interface (standard feature)
● Probe Power Jacks (2)
● 10 MHz Reference Clock I/O
● Monitor Output: CHA/CHB
● Gate Output (measurement period timing output)
● Supply Voltage: 100-200 VAC, 50/60 Hz
5
Ethernet and PC Card Interface (optional)
The Ethernet and PC card interface let you access the TA720 from a PC through a LAN in order to download data from
the TA720’s floppy drive or PC card. You can also transfer waveform data and screenshots from the TA720 to the PC for
saving.
FTP Client Function
Save data and screenshots to a network drive
You can save, delete, and copy waveform data and settings on storage media such as the internal floppy drive or a
hard drive located on a networked PC or workstation. These operations work the same way as when you handle data
on the PC card. In addition, screenshot data can also be saved. The TA720’s FTP client function can be used to save,
delete, and copy waveform data and settings on PCs and workstations running the FTP server function.
FTP Server Function
Access a drive on the TA720 from a PC to download files from the internal floppy drive or PC card
You can download files from the TA720’s internal floppy drive or PC card to a networked PC or workstation. The
TA720’s FTP server function can be used by PCs and workstations running the FTP client function.
Setting TA720 Measurement Conditions and Controlling the Start of Measurement
A PC can be used to set measurement conditions on the TA720 and control when measurement starts and stops.
10BASE-T hub
or router
The TA720’s Ethernet
connector is a 10BASE-T
connector. Connect it to your
network through a hub or
router as shown.
10BASE-T cable
TA720
PC
Storage Media Evaluation Systems—Example Setups Using the TA720
6
DDU-1000
LM330A Blue High-NA
Blue-violet laser phase change optical disk evaluation system
Courtesy of PULSTEC INDUSTRIAL Co., Ltd.
- Transfer rate: 200 Mbps; Tr/Tf: 700 ps Courtesy of ShibaSoku Co., Ltd.
Specification
Specifications
Item
Time stamp mode (T.S. Mode), Hardware histogram mode (H.H. Mode),
Inter-symbol interference analysis mode (ISI mode)
Specifications
Block Sampling
<T.S. Mode>
Number of blocks: 2 to 250 (available within the maximum sampling size,
when Arming source is EXT and Rest Mode is OFF,
or when Arming source is AUTO and Rest Mode is
EVENT or TIME.)
2 to 1000 (available within the maximum sampling size,
when Arming source is AUTO and Rest Mode is OFF.
Display Resolution The larger value, either 25 ps or (the histogram X-axis span) /600
Internal Jitter
100 ps rms
Sampling Rate
80 MS/s continuous (at Single measurement function)
A-to-B time interval continuous measurement condition: At least 0 ns to
edge of next signal A following A-to-B time interval measurement
50 MS/s continuous (at Dual measurement function)
A-to-B time interval continuous measurement condition: At least 13 ns to
edge of next signal A following A-to-B time interval measurement
Maximum Sample
Size
<T.S. mode>
Single measurement function: 1,024,000 samples,
Dual measurement function: 512,000 samples
<H.H mode>
Single measurement function: 109 samples,
Dual measurement function: 109 samples
<ISI mode>
Single measurement function: 1,024,000 samples,
Dual measurement function: 512,000 samples
<H.H. mode>
Number of blocks: 2 to 1000 (determined by the maximum sampling size)
<ISI mode>
Cannot use this function with ISI mode.
• Cannot use this function with Dual measurement function
• Cannot use this function with EXT gate
• Cannot use the EXT Arming when Rest Mode is EVENT or TIME.
<T.S. Mode/H.H. mode>
Single measurement function:
Period (↑/↓)
A-to-B time interval (A↑B↑/ A↓B↑/ A B↑/A↑B↓/A↓B↓/A B↓)
Pulse width ( ↔ / ↔ / ↔↔ )
Dual measurement function:
Period A & Period B (A↑ & B↑/A↓ & B↓)
Period A & A-to-B time interval (A↑ & A↑B↑/ A↓ & A↓B↑)
Pulse width A&A-to-B time interval (CHA- ↔↔ & A to B↑/CHA- ↔↔
& A to B↓)
Pulse width A &Pulse width B (CHA- ↔↔ & CHB- ↔↔ )
Arming source: select from AUTO or EXT
EXT setting:
Trigger level: TTL(1.4 V), TTL/10, 0 V
Time delay: 1 µs ≤ delay time ≤ 1 s (Resolution: 100 ns)
Separate settings can be made on each channel when using dual
measurement functions (Period A & Period B, Pulse Width A & Pulse Width B).
Event delay: 1 to 106 (1 step) cannot use set the event delay when Dual
measurement function)
Slope: ↑/↓
Inhibit
select from ↔
Gate
select from EVENT, TIME or EXT
↔
<ISI mode>
Event gate: Single measurement function: 2 to 1024000,
Dual measurement function: 1 to 512000
Time gate: 1 µs ≤ gate time ≤ 10 s (100 ns step)
EXT gate: 1 µs to 320 s
↔↔
<T.S. mode>
Period: 6 ns to 20 ms
A-to-B time interval: 0 ns to 20 ms
Pulse width: 6 ns to 20 ms
Ethernet and PC
Card Interface
(optional)
<H.H. mode>
Period: 6 ns to 3.2 µs
A-to-B time interval: 0 ns to 3.2 µs
Pulse width: 6 ns to 3.2 µs
Sampling Interval
min or 1 µs to 1 s (1 µs step) (T.S. Mode only)
Inputs to A and B
Channels
Coupling: AC/DC
Impedance: 50 Ω/1 MΩ
Frequency characteristics: DC to 250 MHz (DC coupling)
Minimum input pulse width: 3 ns (2.2 ns at CHB input in A-to-B time
interval measurement)
Operating Voltage range: -5 V to + 5 V
Maximum input voltage: 40 V (DC+ACpeak, DC ≤ input frequency ≤ 100 kHz)
Trigger level: MAN; -5 V to +5 V (1 mV step) ; Accuracy: ± (10 mV + 1% of
setting value)
AUTO=0% to 100% (1% step) ; (Single Auto Trigger / Repeat
Auto Trigger)
Sensitivity: 100 mVp-p
Input amplifier noise: 400 µVrms (Typical value)
Crosstalk: -40 dB (typical value)
Phase setting: 0.0 to 10.0 ns (0.1 ns step) (function permitting CHB phase
difference to be set on CHA)
Maximum sampling time: 320 s (T.S. mode)
3200 s (H.H. mode)
Statistical Values
<T.S. mode>
When histogram is calculated
Average, Maximum, Minimum, Peak-Peak, σ, σ/Average, σ/T, Deviation,
Deviation/T, Median, Mode, Number
When time variation is calculated
T.Average, T.Maximum, T.Minimum, T.Peak-Peak, T.σ, T.(σ/Average),
T.(P-P/Average) , T.RF, T.Number
PC card interface
Supported card type: Flash ATA card (PC card TYPE II)
Functions: Saving settings, measurements, and screenshots
Display
6.4 inch , color TFT LCD (back light On/Off Function)
Internal Memory
Store and recall 32 sets of setup information in the nonvolatile memory
Reference Input
input frequency range: 10 MHz ± 10 Hz
Input level: 1 Vp-p or greater
Monitor Output (CHA/CHB) Output level: 1/4 of measurement input signal (with 50 Ω load)
Gate Output
Timing output for internal measurement period (rear panel BNC connector, TTL level)
Other Function
3.5-inch floppy disk (720 KB, 1.44 MB, MS-DOS compatible)
GP-IB interface (Protocol: conforms to IEEE St'd 488.2 1992)
Built-in Printer: Thermal dot method, Recording width: 104 mm
2 probe power terminals (rear panel, usable FET probe (model 700939),
output voltage: ±12 V)
General
Specification
Source voltage: 100 to 120 VAC, 200 to 240 VAC
Power supply frequency: 50/60 Hz
Maximum power consumption: 250 VA
External dimensions: Approx. 426(W) × 177(H) × 300(D)mm (excluding projections)
Weight: Approx. 12 kg (main unit only)
The above performance specifications are obtained after warm-up under the reference operating condition.
Reference operating conditions: 23 °C ± 5 °C ambient temperature, 50% ± 10% (RH) ambient humidity,
within 1% of supply voltage rating.
■ Dimensions
13(0.51)
<H.H. Mode/ISI mode>
Average, Maximum, Minimum, Peak-Peak, σ, σ/Average, σ/T, Deviation,
Deviation/T, Median, Mode, Number
Inter-Symbol
Interference
Analysis Function
Display Format
Extraction condition: nT/nT to maxT/minT to nT (n is any value)
Measurement condition: Minimum Pulse width: 10 ns, Cannot use the
Inhibit function with Dual measurement function.
Extraction mode: Single, Combination and Between
Missed sample detection: Maximum 256 (a function to interpolate missed
samples when using dual measurement functions)
Condition: At least 100 ns between missed samples
Ethernet communication
Transfer method: Ethernet (10BASE-T)
Transfer rate: 10 Mbps maximum
Supported services: FTP server, FTP client (network drive), DHCP, DNS
426(16.77)
13(0.51)
Unit: mm
(inch)
177(6.97)
<ISI mode>
A-to-B time interval: 0 ns to 3.2 µs
Pulse width: 10 ns to 3.2 µs
↔ (Trigger level: TTL (1.4 V), TTL/10, 0 V)
<H.H. mode>
Event gate: Single measurement function: 2 to 109,
Dual measurement function: 1 to 109
Time gate: 1 µs ≤ gate time ≤ 10 s (100 ns step)
EXT gate: 1 µs to 320 s
<ISI mode>
Single measurement function:
Pulse width ( ↔↔ only)
Dual measurement function:
Pulse width A & A-to-B time interval (CHA- ↔↔ & A↑B↑/CHA- ↔↔ &
A↓B↑/CHA- ↔↔ & A B↑/CHA- ↔↔ & A↑B↓/CHA- ↔↔ &
A↓B↓/CHA- ↔↔ & A B↓)
Pulse width A &Pulse width B (CHA- ↔↔ & CHB- ↔↔ )
Measuring Range
or
<T.S. mode>
Event gate: Single measurement function: 2 to 1024000,
Dual measurement function: 1 to 512000
Time gate: 1 µs ≤ gate time ≤ 10 s (100 ns step)
EXT gate: 1 µs to 320 s
↔
↔
400 ms (when measurering the period of a 1 MHz sine wave with the
sampling size set to 1000 in H.H. Mode)
Function
↔
Measurement
Update Rate
Arming
ESC
23(0.91)
277(10.91)
28(1.10)
12(0.47)
20(0.79)
Item
Sampling Modes
<T.S. mode>
Select from Histogram, Time variation, List and Statistics (statistical data)
<H.H. mode>
Select from Histogram, List and Statistics (statistical data)
<ISI mode>
Select from Histogram and List
Microsoft, MS-DOS, and Windows are either trademarks or registered trademarks of Microsoft Corporation in the US and/or other countries.
See Yokogawa's home page for detailed specifications.
http://www.yokogawa.com/tm/Bu/TA720
7
■ Model and Suffix Codes
Model
Suffix code
704510
Description
TA720 Time Interval Analyzer
Power cable
-D
UL, CSA Standard
-F
VDE Standard
-R
AS Standard
-Q
Option
BS Standard
/C10
Ethernet and PC card interface
/E3
Two FET probes
■ Optional Accessories
Part
Model
Specifications
Order quantity
BNC cable
366924
BNC–BNC (1 meter)
1
BNC cable
366925
BNC–BNC (2 meters)
1
FET probe
700939
900 MHz bandwidth
1
Printer paper (roll)
B9850NX
30 meters (1 roll = 1 unit)
5
Rack mounting kit
751535-E4
For EIA
1
Rack mounting kit
751535-J4
For JIS
1
FET Probe (700939)
Related Models
TA520 Time Interval
Analyzer
TA320 Time Interval
Analyzer
TA120F Digital Jitter
Meter
• Maximum continuous sampling
rate: 43 MS/s
• Maximum sampling size: 109
• Measurement resolution: 25 ps
• Internal jitter: 100 ps rms
• Maximum continuous sampling
rate: 14 MS/s
• Maximum sampling size:
99,999,999
• Measurement resolution: 100 ps
• Internal jitter: 300 ps rms
• Highly accurate, highly
reproducible measurements
• High-speed measurement (50ms measurement period)
• Supports various optical disk
formats (CD, DVD-ROM)
• Bi-phase measurement (optional)
Optical Disk Jitter
Analysis Software
Optical Disk Inter-symbol
Interference Analysis Software
for TA320/TA520
for TA320/TA520
DL1740 Digital
Oscilloscope
DL7200 Digital
Oscilloscope
• Histogram, deviation, jitter, and
trend displays
• Applicable to CD/DVD/MO/MD
• Requires National Instruments
GP-IB board
• Runs under Windows 95/98/NT
• Inter-symbol interference analysis
• Deviation matrix analysis
• Applicable to CD/DVD/MO/MD
• Requires National Instruments
GP-IB board
• Runs under Windows 95/98/NT
• Maximum sampling rate: 1 GS/s
• 500 MHz analog bandwidth
• Maximum record length: 1 MW
• Ethernet Interface 100 BASE-TX
(optional)
• Maximum sampling rate: 2 GS/s
• 500 MHz analog bandwidth
• Maximum record length: 16 MW
• 4 channels analog input and 16bit logic input
NOTICE
● Before operating the product, read the instruction manual thoroughly for
proper and safe operation.
● If this product is for use with a system requiring safeguards that directly
involve personnel safety, please contact the Yokogawa sales offices.
YOKOGAWA ELECTRIC CORPORATION
Test and Measurement Business Div./Phone: (81)-55-243-0313, Fax: (81)-55-243-0396
E-mail: tm@csv.yokogawa.co.jp
YOKOGAWA CORPORATION OF AMERICA Phone: (1)-770-253-7000, Fax: (1)-770-251-2088
YOKOGAWA EUROPE B.V.
Phone: (31)-33-4641806, Fax: (31)-33-4641807
YOKOGAWA ENGINEERING ASIA PTE. LTD Phone: (65)-62419933, Fax: (65)-62412606
Subject to change without notice.
[Ed : 01/b] Copyright ©2002
Printed in Japan, 208(YG)
MS-12E