CERTIFICATE
Issued Date: Dec. 15, 2006
Report No.: 06CL025-ITCEP11V04
This is to certify that the following designated product
Product
: Media Live
Trade name
: MSI
Model Number : MS-6421, Media Live
Company Name : MICRO-STAR INT’L Co., LTD.
This product, which has been issued the test report listed as above in QuieTek
Laboratory, is based on a single evaluation of one sample and confirmed to
comply with the requirements of the following EMC standard.
EN 55022: 1998+A1: 2000+A2: 2003
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2: 2000
IEC 61000-4-2 Edition 1.2: 2001-04
EN 61000-3-3: 1995 + A1: 2001
IEC 61000-4-3: 2002+A1: 2002
IEC 61000-4-4: 2004
IEC 61000-4-5 Edition 1.1: 2001-04
IEC 61000-4-6 Edition 2.1: 2004-11
IEC 61000-4-8 Edition 1.1: 2001-03
IEC 61000-4-11 Second Edition: 2004-03
TEST LABORATORY
George Chen / President
No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quietek.com http://www.quietek.com
Test Report
Product Name : Media Live
Model No.
: MS-6421, Media Live
Applicant : MICRO-STAR INT’L Co., LTD.
Address : No. 69, Li-De St., Jung-He City, Taipei Hsien,
Taiwan, R.O.C.
Date of Receipt : 2006/12/01
Issued Date
: 2006/12/15
Report No.
: 06CL025-ITCEP11V04
The test results relate only to the samples tested.
The test results shown in the test report are traceable to the national/international standard through the calibration
of the equipment and evaluated measurement uncertainty herein.
This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity
The following product is herewith confirmed to comply with the requirements set out in the
Council Directive on the Approximation of the laws of the Member States relating to
Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were
applied:
The following Equipment:
Product
: Media Live
Model Number
: MS-6421, Media Live
Trade Name
: MSI
This product is herewith confirmed to comply with the requirements set out in the
Council Directive on the Approximation of the laws of the Member States relating to
Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding
EMC, the following standards were applied:
RFI Emission:
EN 55022:1998+A1:2000+A2:2003 Class B
: Product family standard
EN 61000-3-2:2000, Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1: 2001
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1:2001+A2:2003
: Product family standard
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address :
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Position/ Title
Date
Legal Signature
QTK No.: 06CL025-ITCEP11V04
Statement of Conformity
This certifies that the following designated product:
Product
: Media Live
Model Number
: MS-6421, Media Live
Trade Name
: MSI
Company Name
: MICRO-STAR INT'L Co., LTD.
This product is herewith confirmed to comply with the requirements set out in the
Council Directive on the Approximation of the laws of the Member States relating to
Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding
EMC, the following standards were applied:
RFI Emission:
EN 55022:1998+A1:2000+A2:2003 Class B
: Product family standard
EN 61000-3-2:2000, Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1:2001
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
: Product family standard
EN 55024:1998+A1:2001+A2:2003
TEST LABORATORY
0914
George Chen / President
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Report No: 06CL025-ITCEP11V04
Test Report Certification
Issued Date
Report No.
: 2006/12/15
: 06CL025-ITCEP11V04
Product Name
:
Media Live
Applicant
:
MICRO-STAR INT’L Co., LTD.
Address
:
No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Manufacturer
:
MICRO-STAR INT’L Co., LTD.
Model No.
:
MS-6421, Media Live
Rated Voltage
:
AC 230 V / 50 Hz
EUT Voltage
:
AC 120-240V, 50/60Hz
Trade Name
:
MSI
Applicable Standard
:
EN 55022: 1998+A1: 2000+A2: 2003 Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2000, EN 61000-3-3:1995+A1: 2001
AS/NZS CISPR 22: 2004
Test Result
:
Complied
Performed Location
:
Linkou EMC laboratory
No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,
Taipei, 244 Taiwan, R.O.C.
TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
Documented By
:
(
Reviewed By
Approved By
Anita Chou
)
:
(
Nonny Chen
)
(
George Chen
)
:
Page: 2 of 90
Report No: 06CL025-ITCEP11V04
Laboratory Information
We , QuieTek Corporation, are an independent EMC and safety consultancy that was
established the whole facility in our laboratories. The test facility has been accredited by the
following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:
Taiwan R.O.C.
:
BSMI, DGT, CNLA
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded
from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/
The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site :
http://www.quietek.com/
If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307,
Taiwan, R.O.C.
TEL:+886-3-592-8858 / FAX:+886-3-592-8859
E-Mail : service@quietek.com
1313
LinKou Testing Laboratory :
No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
0914
Page: 3 of 90
Report No: 06CL025-ITCEP11V04
TABLE OF CONTENTS
Description
Page
1. General Information .................................................................................................... 7
1.1. EUT Description ...................................................................................................... 7
1.2. Mode of Operation .................................................................................................. 8
1.3. Tested System Details............................................................................................. 9
1.4. Configuration of Tested System ............................................................................ 10
1.5. EUT Exercise Software ......................................................................................... 11
2. Technical Test ........................................................................................................... 12
2.1. Summary of Test Result ........................................................................................ 12
2.2. List of Test Equipment ........................................................................................... 13
2.3. Measurement Uncertainty ..................................................................................... 16
2.4. Test Environment .................................................................................................. 18
3. Conducted Emission (Main Terminals)...................................................................... 20
3.1. Test Specification .................................................................................................. 20
3.2. Test Setup ............................................................................................................. 20
3.3. Limit....................................................................................................................... 20
3.4. Test Procedure ...................................................................................................... 21
3.5. Deviation from Test Standard ................................................................................ 21
3.6. Test Result ............................................................................................................ 22
3.7. Test Photograph .................................................................................................... 28
4. Conducted Emissions (Telecommunication Ports).................................................... 29
4.1. Test Specification .................................................................................................. 29
4.2. Test Setup ............................................................................................................. 29
4.3. Limit....................................................................................................................... 29
4.4. Test Procedure ...................................................................................................... 30
4.5. Deviation from Test Standard ................................................................................ 30
4.6. Test Result ............................................................................................................ 31
4.7. Test Photograph .................................................................................................... 43
5. Radiated Emission.................................................................................................... 46
5.1. Test Specification .................................................................................................. 46
5.2. Test Setup ............................................................................................................. 46
5.3. Limit....................................................................................................................... 46
5.4. Test Procedure ...................................................................................................... 47
5.5. Deviation from Test Standard ................................................................................ 47
5.6. Test Result ............................................................................................................ 48
5.7. Test Photograph .................................................................................................... 50
6. Harmonic Current Emission ...................................................................................... 51
Page: 4 of 90
Report No: 06CL025-ITCEP11V04
6.1. Test Specification .................................................................................................. 51
6.2. Test Setup ............................................................................................................. 51
6.3. Limit....................................................................................................................... 51
6.4. Test Procedure ...................................................................................................... 53
6.5. Deviation from Test Standard ................................................................................ 53
6.6. Test Result ............................................................................................................ 54
6.7. Test Photograph .................................................................................................... 56
7. Voltage Fluctuation and Flicker ................................................................................. 57
7.1. Test Specification .................................................................................................. 57
7.2. Test Setup ............................................................................................................. 57
7.3. Limit....................................................................................................................... 57
7.4. Test Procedure ...................................................................................................... 58
7.5. Deviation from Test Standard ................................................................................ 58
7.6. Test Result ............................................................................................................ 59
7.7. Test Photograph .................................................................................................... 60
8. Electrostatic Discharge ............................................................................................. 61
8.1. Test Specification .................................................................................................. 61
8.2. Test Setup ............................................................................................................. 61
8.3. Limit....................................................................................................................... 61
8.4. Test Procedure ...................................................................................................... 62
8.5. Deviation from Test Standard ................................................................................ 62
8.6. Test Result ............................................................................................................ 63
8.7. Test Photograph .................................................................................................... 64
9. Radiated Susceptibility ............................................................................................. 65
9.1. Test Specification .................................................................................................. 65
9.2. Test Setup ............................................................................................................. 65
9.3. Limit....................................................................................................................... 65
9.4. Test Procedure ...................................................................................................... 66
9.5. Deviation from Test Standard ................................................................................ 66
9.6. Test Result ............................................................................................................ 67
9.7. Test Photograph .................................................................................................... 68
10.
Electrical Fast Transient/Burst............................................................................... 69
10.1.
Test Specification ............................................................................................... 69
10.2.
Test Setup.......................................................................................................... 69
10.3.
Limit ................................................................................................................... 69
10.4.
Test Procedure .................................................................................................. 70
10.5.
Deviation from Test Standard............................................................................. 70
10.6.
Test Result......................................................................................................... 71
Page: 5 of 90
Report No: 06CL025-ITCEP11V04
10.7.
11.
11.1.
11.2.
11.3.
11.4.
11.5.
11.6.
11.7.
12.
12.1.
12.2.
12.3.
12.4.
12.5.
12.6.
12.7.
13.
13.1.
13.2.
13.3.
13.4.
13.5.
13.6.
13.7.
14.
14.1.
14.2.
14.3.
14.4.
14.5.
14.6.
14.7.
15.
Test Photograph ................................................................................................ 72
Surge..................................................................................................................... 73
Test Specification ............................................................................................... 73
Test Setup.......................................................................................................... 73
Limit ................................................................................................................... 73
Test Procedure .................................................................................................. 74
Deviation from Test Standard............................................................................. 74
Test Result......................................................................................................... 75
Test Photograph ................................................................................................ 76
Conducted Susceptibility ....................................................................................... 77
Test Specification ............................................................................................... 77
Test Setup.......................................................................................................... 77
Limit ................................................................................................................... 78
Test Procedure .................................................................................................. 78
Deviation from Test Standard............................................................................. 78
Test Result......................................................................................................... 79
Test Photograph ................................................................................................ 80
Power Frequency Magnetic Field .......................................................................... 81
Test Specification ............................................................................................... 81
Test Setup.......................................................................................................... 81
Limit ................................................................................................................... 81
Test Procedure .................................................................................................. 81
Deviation from Test Standard............................................................................. 81
Test Result......................................................................................................... 82
Test Photograph ................................................................................................ 83
Voltage Dips and Interruption ................................................................................ 84
Test Specification ............................................................................................... 84
Test Setup.......................................................................................................... 84
Limit ................................................................................................................... 84
Test Procedure .................................................................................................. 85
Deviation from Test Standard............................................................................. 85
Test Result......................................................................................................... 86
Test Photograph ................................................................................................ 87
Attachment ............................................................................................................ 88
EUT Photograph.................................................................................................... 88
Page: 6 of 90
Report No: 06CL025-ITCEP11V04
1. General Information
1.1. EUT Description
Product Name
Trade Name
Model No.
Media Live
MSI
MS-6421, Media Live
Component
CPU
AMD Athlon (tm) 64, Processor 3800+, 3.8GHz
Motherboard
MSI, MS-6421
HDD
Samsung, HD160JJ/COM
DVD-ROM
Panasonic, UJ-845
DDR-RAM
Samsung, M378T3354CZ0-CD5, 256MB*4
Power Supply
FSP, FSP300-62GLS
Note:
The EUT is including two models, The MS-6421 for MSI and the Media Live for different
marketing requirement.
Page: 7 of 90
Report No: 06CL025-ITCEP11V04
1.2. Mode of Operation
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Mode 2: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+YCbCr 1024*768/60Hz
Mode 3: AMD Athlon 64 Processor 3.8GHz,HDMI 1920*1080/60Hz+AV 1024*768/60Hz
Mode 4: AMD Athlon 64 Processor 3.8GHz,HDMI 1920*1080/60Hz+S-Video 1024*768/60Hz
Final Test Mode
Emission
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Immunity
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Page: 8 of 90
Report No: 06CL025-ITCEP11V04
1.3. Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system (including
inserted cards) are:
Product
Manufacturer
Model No.
Serial No.
Power Cord
1
Monitor
SONY
CPD-G500
2706563
Non-Shielded, 1.8m
2
Microphone &
N/A
MIC-06
N/A
N/A
Creative
S80130
AM01303200000941 Non-Shielded, 1.9m
Earphone
3
Cambridge
SoundWorks
4
Keyboard
BTC
5200U
N/A
N/A
5
USB Mouse
Logitech
M-BE58
HCA30103239
N/A
6
USB 2.0 HDD
TeraSys
F12-UF
A0100215-64b0003
Non-Shielded 1.8m
7
USB 2.0 HDD
TeraSys
F12-UF
A0100215-64b0016
Non-Shielded 1.8m
8
USB 2.0 HDD
AACOM
F12-UF
N/A
Power by PC
9
USB 2.0 HDD
TeraSys
F12-UF
A0100215-64b0012
Non-Shielded 1.8m
10 USB 2.0 HDD
TeraSys
F12-UF
A0100215-64b0005
Non-Shielded, 1.8m
11 USB 2.0 HDD
TeraSys
F12-UF
A0100215-64b0015
Non-Shielded 1.8m
12 Speaker
IBM
IBM FRU PN 09N5395 N/A
N/A
13 Speaker
IBM
IBM FRU PN 09N5395 N/A
N/A
14 Speaker
IBM
IBM FRU PN 09N5395 N/A
N/A
15 Speaker
IBM
IBM FRU PN 09N5395 N/A
N/A
16 Speaker
IBM
IBM FRU PN 09N5395 N/A
N/A
17 Speaker
IBM
IBM FRU PN 09N5395 N/A
N/A
18 Monitor
TATUNG
GTVL27W23HD
N/A
Non-Shielded 1.8m
19 Notebook PC
ASUS
S1300
24NP035390
Non-shielded, 1.8m
Page: 9 of 90
Report No: 06CL025-ITCEP11V04
1.4. Configuration of Tested System
Connection Diagram
Signal Cable Type
Signal cable Description
A
D-SUB Cable
Shielded, 1.8m, with two ferrite cores bonded
B
Earphone & Microphone Cable
Non-Shielded, 1.6m
C
COAXIAL Cable
Shielded, 1.8m
D
Fiber Cable
Non-Shielded, 1.5m
E
USB Cable
Shielded, 1.5m
F
USB Cable
Shielded, 1.5m
G
1394 Cable
Shielded, 1.2m
H
1394 Cable
Shielded, 1.2m
I
USB Cable
Shielded, 1.5m, four PCS.
J
Speaker Cable (RCA)
Non-Shielded, 1.2m, six PCS.
K
RCA Cable (YCbCr)
Non-Shielded, 1.5m
L
RCA to Audio Cable
Non-Shielded, 1.5m
M
RCA Cable
Non-Shielded, 1.5m
N
S-VIDEO Cable
Shielded, 1.6m
O
HDMI Cable
Shielded, 1m
P
LAN Cable
Non-Shielded, 7m
Page: 10 of 90
Report No: 06CL025-ITCEP11V04
1.5. EUT Exercise Software
1
Setup the EUT and simulators as shown on 1.4.
2
Turn on the power of all equipment.
3
Personal Computer reads data from disk.
4
Personal Computer sends “H” pattern to printer, the printer will print “H” pattern on paper.
5
Personal Computer reads and writes data into and from modem.
6
Personal Computer will read data from floppy disk and then writes the data into floppy disk , same
operation for hard disk.
7
Repeat the above procedure (4) to (6).
Page: 11 of 90
Report No: 06CL025-ITCEP11V04
2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards
Deviations from the test standards as below description:
Emission
Performed Item
Normative References
Conducted Emission
EN 55022:1998+A1:2000+A2:2003 Class B
Test
Performed
Deviation
Yes
No
Yes
No
Yes
No
AS/NZS CISPR 22: 2004
Impedance Stabilization
EN 55022:1998+A1:2000+A2:2003 Class B
Network
AS/NZS CISPR 22: 2004
Radiated Emission
EN 55022:1998+A1:2000+A2:2003 Class B
AS/NZS CISPR 22: 2004
Power Harmonics
EN 61000-3-2:2000
Yes
No
Voltage Fluctuation and
EN 61000-3-3:1995+A1:2001
Yes
No
Flicker
Immunity
Test
Performed Item
Normative References
Electrostatic Discharge
IEC 61000-4-2 Edition 1.2: 2001-04
Yes
No
Radiated susceptibility
IEC 61000-4-3:2002+A1:2002
Yes
No
Electrical fast transient/burst IEC 61000-4-4:2004
Yes
No
Surge
IEC 61000-4-5 Edition 1.1: 2001-04
Yes
No
Conducted susceptibility
IEC 61000-4-6 Edition 2.1: 2004-11
Yes
No
Power frequency magnetic
IEC 61000-4-8 Edition 1.1: 2001-03
Yes
No
Yes
No
Performed
Deviation
field
Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03
Page: 12 of 90
Report No: 06CL025-ITCEP11V04
2.2. List of Test Equipment
Conducted Emission / SR1
Instrument
EMI Test Receiver
LISN
LISN
Pulse Limiter
Manufacturer
R&S
R&S
R&S
R&S
Impedance Stabilization Network / SR1
Instrument
Manufacturer
Schaffner NSG 2070
N/A
RF-Generator
Capacitive Voltage Probe
Schaffner
EMI Test Receiver
R&S
LISN
R&S
LISN
R&S
lmpedance Stabilization
Schaffner
Network
Pulse Limiter
R&S
Type No.
ESCS 30
ENV4200
ESH3-Z5
ESH3-Z2
Serial No
836858/022
833209/007
836679/020
357.88.10.52
Cal. Date
2006/02/18
2006/07/13
2006/02/14
2006/09/04
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
CVP2200A
ESCS 30
ESH3-Z5
ENV4200
18331
836858/022
836679/020
833209/007
2006/11/10
2006/02/18
2006/02/14
2006/07/13
ISN T400
19099
2006/07/15
ESH3-Z2
F-65
10KHz~1GHz
357.88.10.52
2006/09/04
198
2006/11/10
Serial No
2704
208
838251/001
838786/004
305
N/A
Cal. Date
2006/08/09
2006/07/25
2006/05/11
2006/06/19
2006/08/10
2006/01/03
925974
2006/01/03
101102468
2006/10/24
RF Current Probe
FCC
Radiated Emission / Site3
Instrument
Bilog Antenna
Broadband Horn Antenna
EMI Test Receiver
EMI Test Receiver
Horn Antenna
Pre-Amplifier
Manufacturer
Schaffner Chase
Schwarzbeck
R&S
R&S
Schwarzbeck
QTK
Pre-Amplifier
MITEQ
Spectrum Analyzer
Advantest
Type No.
CBL6112B
BBHA9170
ESCS 30
ESI 26
BBHA9120D
N/A
AMF-4D-18040
0-45-6P
R3162
Manufacturer
Type No.
Serial No
Cal. Date
Schaffner
NSG 1007
HK54148
2006/06/29
Schaffner
CCN 1000-1
X7 1887
2006/06/29
Type No.
Serial No
Cal. Date
NSG 1007
HK54148
2006/06/29
CCN 1000-1
X7 1887
2006/06/29
Power Harmonics / SR3
Instrument
AC Power
Source(Harmonic)
IEC1000-4-X
Analyzer(Flicker)
Voltage Fluctuation and Flicker / SR3
Instrument
Manufacturer
AC Power
Schaffner
Source(Harmonic)
IEC1000-4-X
Schaffner
Analyzer(Flicker)
Page: 13 of 90
Report No: 06CL025-ITCEP11V04
Electrostatic Discharge / SR6
Instrument
Manufacturer
ESD Simulator System
KeyTek
Horizontal Coupling
QuieTek
Plane(HCP)
Vertical Coupling
QuieTek
Plane(VCP)
Radiated susceptibility / CB5
Instrument
Manufacturer
Type No.
MZ-15/EC
Serial No
0112372
Cal. Date
2006/08/02
HCP AL50
N/A
N/A
VCP AL50
N/A
N/A
Serial No
Cal. Date
100007
N/A
100137
2450
1085
2006/03/16
2006/01/03
2006/08/02
AF-BOX
R&S
Audio Analyzer
Bilog Antenna
Broad-Band Antenna
CMU200
UNIV.RADIOCOMM
Directional Coupler
Dual Microphone Supply
Mouth Simulator
Power Amplifier
Power Amplifier
Power Meter
Pre-Amplifier
Probe Microphone
R&S
Schaffner Chase
Schwarzbeck
Type No.
AF-BOX
ACCUST
UPL 16
CBL6112B
VULB 9166
R&S
CMU200
104846
2006/03/16
A&R
B&K
B&K
A&R
A&R
R&S
A&R
B&K
22735
2426784
2439692
309453
A285000010
100219
23067
2278070
2006/08/03
2006/08/04
2006/08/04
N/A
N/A
2006/04/21
N/A
2006/08/04
Signal Generator
R&S
DC 6180
5935
4227
30S1G3
100W10000M7
NRVD(P.M)
150A220
4182
SMY02(9K-208
0)
825454/028
2006/09/22
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
Manufacturer
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
N/A
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
Type No.
INA 2141
INA 702
Serial No
6002
199749-020IN
Cal. Date
N/A
N/A
MV3
N/A
N/A
4090
9852
2006/05/30
Electrical fast transient/burst / SR2
Instrument
Manufacturer
Schaffner NSG 2050
N/A
System Mainframe
Surge / SR2
Instrument
Schaffner NSG 2050
System Mainframe
Conducted susceptibility / SR6
Instrument
Manufacturer
Schaffner NSG 2070
N/A
RF-Generator
Power frequency magnetic field / SR3
Instrument
Manufacturer
Induction Coil Interface
Schaffner
Magnetic Loop Coil
Schaffner
Magnetic/Electric field
Lackmann Phymetric
measuring system
Triaxial ELF Magnetic Field
F.B.BELL
Meter
Page: 14 of 90
Report No: 06CL025-ITCEP11V04
Voltage dips and interruption / SR2
Instrument
Manufacturer
Schaffner NSG 2050
N/A
System Mainframe
Schaffner NSG 2050 System Mainframe
Instrument
Manufacturer
Burst 4.8KV/16A
Schaffner
Generator with CDN
Damped osc. Wave
Schaffner
100kHz and 1MHz
Double AC Source Variator Schaffner
Hybrid surge pulse
Schaffner
1.2/50uS
PQT Generator
Schaffner
Pulse COUPLING
Schaffner
NETWORK
Schaffner NSG 2070 RF-Generator
Instrument
Manufacturer
CDN
Schaffner
CDN
Schaffner
CDN M016S
Schaffner
CDN M016S
Schaffner
CDN T002
Schaffner
CDN T002
Schaffner
CDN T400
Schaffner
CDN T400
Schaffner
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
EM-CLAMP
Schaffner
Type No.
Serial No
Cal. Date
N/A
N/A
N/A
Type No.
Serial No
PNW2225
200123-098SC 2005/12/28
PNW2056
200124-058SC 2005/12/28
NSG 642A
30910014938
2005/12/28
PNW 2050
20532-514LU
2006/01/03
PNW2003
200138-007SC 2006/01/02
CDN131
200124-007SC 2005/12/28
Type No.
CAL U100A
TRA U150
CAL U100A
TRA U150
CAL U100
TRA U150
CAL U100
TRA U150
Serial No
20405
20454
20410
21167
20491
21169
17735
21166
Cal. Date
2006/03/27
2006/03/27
2006/03/27
2006/03/27
2006/03/27
2006/03/27
2006/03/27
2006/03/27
CDN M016S
20822
2006/03/27
CDN M016S
20823
2006/03/27
CDN T002
19018
2006/03/27
CDN T400
21226
2006/03/27
KEMZ 801
21024
2006/04/21
Page: 15 of 90
Cal. Date
Report No: 06CL025-ITCEP11V04
2.3. Measurement Uncertainty
Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Impedance Stabilization Network
The measurement uncertainty is evaluated as ± 2.26 dB.
Radiated Emission
The measurement uncertainty is evaluated as ± 3.19 dB.
Electrostatic Discharge
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant ESD standards.
The immunity test signal from the ESD system meet the required specifications in IEC
61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
Radiated susceptibility
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in RS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant RS standards.
The immunity test signal from the RS system meet the required specifications in IEC
61000-4-3 through the calibration for the uniform field strength and monitoring for the test
level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Electrical fast transient/burst
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst
standards. The immunity test signal from the EFT/Burst system meet the required
specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty
for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 10-10 and
2.76%.
Surge
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in Surge testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant Surge
standards. The immunity test signal from the Surge system meet the required specifications
in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the
waveform of voltage and timing as being 1.63 % and 2.76%.
Conducted susceptibility
Page: 16 of 90
Report No: 06CL025-ITCEP11V04
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in CS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant CS standards.
The immunity test signal from the CS system meet the required specifications in IEC
61000-4-6 through the calibration for unmodulated signal and monitoring for the test level
with the uncertainty evaluation report for the injected modulated signal level through CDN
and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.
Power frequency magnetic field
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant PFM standards.
The immunity test signal from the PFM system meet the required specifications in IEC
61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter
to verify the output level of magnetic field strength as being 2 %.
Voltage dips and interruption
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant DIP standards.
The immunity test signal from the DIP system meet the required specifications in IEC
61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
Page: 17 of 90
Report No: 06CL025-ITCEP11V04
2.4. Test Environment
Performed Item
Conducted
Emission
Items
Required
Actual
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
24
Humidity (%RH)
30-60
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
23
Humidity (%RH)
25-75
46
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
23
Humidity (%RH)
25-75
46
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
23
Humidity (%RH)
10-75
47
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
24
Humidity (%RH)
25-75
46
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
24
25-75
47
Impedance
Stabilization
Network
Radiated
Emission
Electrostatic
Discharge
Radiated
susceptibility
Electrical fast
transient/burst
Surge
Conducted
susceptibility
Power frequency Humidity (%RH)
Page: 18 of 90
Report No: 06CL025-ITCEP11V04
magnetic field
Voltage dips and
interruption
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
23
Humidity (%RH)
25-75
47
Barometric pressure (mbar)
860-1060
950-1000
Page: 19 of 90
Report No: 06CL025-ITCEP11V04
3. Conducted Emission (Main Terminals)
3.1. Test Specification
According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004
3.2. Test Setup
3.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
66 - 56
56 – 46
0.50-5.0
56
46
5.0 - 30
60
50
Remarks: In the above table, the tighter limit applies at the band edges.
Page: 20 of 90
Report No: 06CL025-ITCEP11V04
3.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through
a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must
be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using
a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard
No deviation.
Page: 21 of 90
Report No: 06CL025-ITCEP11V04
3.6. Test Result
Site : SR-1
Time : 2006/12/09 - 00:48
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Media Live
Probe : LISN-020(L) - Line1
Power : AC 230V/50Hz
Note : Mode 1
Page: 22 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 00:49
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Media Live
Probe : LISN-020(L) - Line1
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
0.202
33.760
33.962
-30.924
64.886
QUASIPEAK
2
0.244
0.203
25.940
26.143
-37.171
63.314
QUASIPEAK
1.056
0.244
33.650
33.894
-22.106
56.000
QUASIPEAK
4
2.642
0.295
33.130
33.425
-22.575
56.000
QUASIPEAK
5
6.099
0.451
31.250
31.701
-28.299
60.000
QUASIPEAK
6
16.462
0.919
30.510
31.429
-28.571
60.000
QUASIPEAK
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 23 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 00:49
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Media Live
Probe : LISN-020(L) - Line1
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
0.202
13.730
13.932
-40.954
54.886
AVERAGE
2
0.244
0.203
17.360
17.563
-35.751
53.314
AVERAGE
1.056
0.244
32.800
33.044
-12.956
46.000
AVERAGE
4
2.642
0.295
32.390
32.685
-13.315
46.000
AVERAGE
5
6.099
0.451
30.150
30.601
-19.399
50.000
AVERAGE
6
16.462
0.919
20.790
21.709
-28.291
50.000
AVERAGE
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 24 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 00:45
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Media Live
Probe : LISN-020(N) - Line2
Power : AC 230V/50Hz
Note : Mode 1
Page: 25 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 00:46
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Media Live
Probe : LISN-020(N) - Line2
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.248
0.203
32.040
32.243
-30.957
63.200
QUASIPEAK
2
0.373
0.214
26.290
26.504
-33.125
59.629
QUASIPEAK
0.529
0.217
37.360
37.577
-18.423
56.000
QUASIPEAK
4
1.056
0.234
35.190
35.424
-20.576
56.000
QUASIPEAK
5
2.615
0.295
34.420
34.715
-21.285
56.000
QUASIPEAK
6
21.298
0.784
27.260
28.044
-31.956
60.000
QUASIPEAK
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 26 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 00:46
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Media Live
Probe : LISN-020(N) - Line2
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.248
0.203
30.790
30.993
-22.207
53.200
AVERAGE
2
0.373
0.214
20.310
20.524
-29.105
49.629
AVERAGE
0.529
0.217
37.330
37.547
-8.453
46.000
AVERAGE
4
1.056
0.234
34.520
34.754
-11.246
46.000
AVERAGE
5
2.615
0.295
32.320
32.615
-13.385
46.000
AVERAGE
6
21.298
0.784
18.170
18.954
-31.046
50.000
AVERAGE
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 27 of 90
Report No: 06CL025-ITCEP11V04
3.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Front View of Conducted Test
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Back View of Conducted Test
Page: 28 of 90
Report No: 06CL025-ITCEP11V04
4. Conducted Emissions (Telecommunication Ports)
4.1. Test Specification
According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004
4.2. Test Setup
4.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
84 – 74
74 – 64
0.50 - 30
74
64
Remarks:
The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50
MHz.
Page: 29 of 90
Report No: 06CL025-ITCEP11V04
4.4. Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance.
Both alternative cables are tested related to the LCL requested. The measurement range is
from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.
The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is
used for alternative one.
4.5. Deviation from Test Standard
No deviation.
Page: 30 of 90
Report No: 06CL025-ITCEP11V04
4.6. Test Result
Site : SR-1
Time : 2006/12/09 - 01:25
Limit : ISN_Voltage_B_10db_00M_QP
Margin : 10
EUT : Media Live
Probe : ISN-T400 - Line1
Power : AC 230V/50Hz
Note : ISN 10Mbps
Page: 31 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 01:28
Limit : ISN_Voltage_B_10db_00M_QP
Margin : 0
EUT : Media Live
Probe : ISN-T400 - Line1
Power : AC 230V/50Hz
Note : ISN 10Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
5.002
9.766
36.260
46.026
-27.974
74.000
QUASIPEAK
2
7.556
9.791
45.740
55.531
-28.469
84.000
QUASIPEAK
10.000
9.813
57.880
67.693
-16.307
84.000
QUASIPEAK
4
13.252
9.837
43.960
53.797
-30.203
84.000
QUASIPEAK
5
15.005
9.843
40.940
50.783
-33.217
84.000
QUASIPEAK
6
29.994
10.000
33.710
43.710
-40.290
84.000
QUASIPEAK
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 32 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 01:28
Limit : ISN_Voltage_B_10db_00M_AV
Margin : 0
EUT : Media Live
Probe : ISN-T400 - Line1
Power : AC 230V/50Hz
Note : ISN 10Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
5.002
9.766
13.790
23.556
-40.444
64.000
AVERAGE
2
7.556
9.791
32.040
41.831
-32.169
74.000
AVERAGE
10.000
9.813
39.210
49.023
-24.977
74.000
AVERAGE
4
13.252
9.837
25.840
35.677
-38.323
74.000
AVERAGE
5
15.005
9.843
21.000
30.843
-43.157
74.000
AVERAGE
6
29.994
10.000
20.180
30.180
-43.820
74.000
AVERAGE
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 33 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 01:22
Limit : ISN_Voltage_B_10db_00M_QP
Margin : 10
EUT : Media Live
Probe : ISN-T400 - Line1
Power : AC 230V/50Hz
Note : ISN 100Mbps
Page: 34 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 01:23
Limit : ISN_Voltage_B_10db_00M_QP
Margin : 0
EUT : Media Live
Probe : ISN-T400 - Line1
Power : AC 230V/50Hz
Note : ISN 100Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
10.060
9.814
52.470
62.284
-21.716
84.000
QUASIPEAK
2
13.357
9.838
57.920
67.758
-16.242
84.000
QUASIPEAK
3
16.228
9.856
59.790
69.646
-14.354
84.000
QUASIPEAK
4
19.709
9.873
58.760
68.633
-15.367
84.000
QUASIPEAK
23.127
9.918
62.400
72.318
-11.682
84.000
QUASIPEAK
26.486
9.953
59.410
69.363
-14.637
84.000
QUASIPEAK
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 35 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 01:23
Limit : ISN_Voltage_B_10db_00M_AV
Margin : 0
EUT : Media Live
Probe : ISN-T400 - Line1
Power : AC 230V/50Hz
Note : ISN 100Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
10.060
9.814
49.930
59.744
-14.256
74.000
AVERAGE
2
13.357
9.838
55.320
65.158
-8.842
74.000
AVERAGE
3
16.228
9.856
56.950
66.806
-7.194
74.000
AVERAGE
4
19.709
9.873
56.150
66.023
-7.977
74.000
AVERAGE
23.127
9.918
59.560
69.478
-4.522
74.000
AVERAGE
26.486
9.953
56.650
66.603
-7.397
74.000
AVERAGE
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 36 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 02:09
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Media Live
Probe : CVP-2200A - Line1
Power : AC 230V/50Hz
Note : ISN 1G Voltage
Page: 37 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 02:11
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Media Live
Probe : CVP-2200A - Line1
Power : AC 230V/50Hz
Note : ISN 1G Voltage
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
20.102
41.510
61.612
-21.274
82.886
QUASIPEAK
2
0.287
20.104
38.730
58.834
-21.252
80.086
QUASIPEAK
3
0.384
20.105
34.470
54.575
-22.739
77.314
QUASIPEAK
0.529
20.107
33.900
54.007
-19.993
74.000
QUASIPEAK
5
0.685
20.109
27.240
47.349
-26.651
74.000
QUASIPEAK
6
11.892
20.258
32.350
52.608
-21.392
74.000
QUASIPEAK
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 38 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 02:11
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Media Live
Probe : CVP-2200A - Line1
Power : AC 230V/50Hz
Note : ISN 1G Voltage
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
20.102
41.450
61.552
-11.334
72.886
AVERAGE
2
0.287
20.104
38.710
58.814
-11.272
70.086
AVERAGE
3
0.384
20.105
32.920
53.025
-14.289
67.314
AVERAGE
0.529
20.107
33.880
53.987
-10.013
64.000
AVERAGE
5
0.685
20.109
18.710
38.819
-25.181
64.000
AVERAGE
6
11.892
20.258
28.260
48.518
-15.482
64.000
AVERAGE
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 39 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 02:12
Limit : ISN_Current_B_00M_QP
Margin : 10
EUT : Media Live
Probe :
Power : AC 230V/50Hz
Note : ISN 1G Current
Page: 40 of 90
- Line1
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 02:14
Limit : ISN_Current_B_00M_QP
Margin : 0
EUT : Media Live
Probe :
Power : AC 230V/50Hz
Note : ISN 1G Current
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.189
0.102
16.910
17.012
-21.874
38.886
QUASIPEAK
2
0.287
0.104
11.540
11.644
-24.442
36.086
QUASIPEAK
3
1.685
0.122
7.570
7.692
-22.308
30.000
QUASIPEAK
4
1.931
0.125
7.670
7.795
-22.205
30.000
QUASIPEAK
7.947
0.206
8.490
8.696
-21.304
30.000
QUASIPEAK
12.693
0.269
7.580
7.849
-22.151
30.000
QUASIPEAK
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 41 of 90
Report No: 06CL025-ITCEP11V04
Site : SR-1
Time : 2006/12/09 - 02:14
Limit : ISN_Current_B_00M_AV
Margin : 0
EUT : Media Live
Probe :
Power : AC 230V/50Hz
Note : ISN 1G Current
1
*
- Line1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.189
0.102
16.810
16.912
-11.974
28.886
AVERAGE
2
0.287
0.104
10.710
10.814
-15.272
26.086
AVERAGE
3
1.685
0.122
1.660
1.782
-18.218
20.000
AVERAGE
4
1.931
0.125
2.130
2.255
-17.745
20.000
AVERAGE
5
7.947
0.206
3.200
3.406
-16.594
20.000
AVERAGE
6
12.693
0.269
2.350
2.619
-17.381
20.000
AVERAGE
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 42 of 90
Report No: 06CL025-ITCEP11V04
4.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Front View of ISN Test
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Back View of ISN Test
Page: 43 of 90
Report No: 06CL025-ITCEP11V04
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Front View of ISN Test - GIGA VOL
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Back View of ISN Test - GIGA VOL
Page: 44 of 90
Report No: 06CL025-ITCEP11V04
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Front View of ISN Test - GIGA CUR
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Back View of ISN Test - GIGA CUR
Page: 45 of 90
Report No: 06CL025-ITCEP11V04
5. Radiated Emission
5.1. Test Specification
According to EMC Standard : EN 55022 and AS/NZS CISPR 22
5.2. Test Setup
5.3. Limit
Limits
Frequency
(MHz)
Distance (m)
dBuV/m
30 – 230
10
30
230 – 1000
10
37
Remark:
1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring instrument antenna
and the closed point of any part of the device or system.
Page: 46 of 90
Report No: 06CL025-ITCEP11V04
5.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The
turn table can rotate 360 degrees to determine the position of the maximum emission level.
The EUT was positioned such that the distance from antenna to the EUT was 10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to
find the maximum emission, all of the interface cables must be manipulated on radiated
measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10
meters.
5.5. Deviation from Test Standard
No deviation.
Page: 47 of 90
Report No: 06CL025-ITCEP11V04
5.6. Test Result
Site : OATS-3
Time : 2006/12/01 - 15:07
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Media Live
Probe : CBL6112B-(2918) - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
167.400
11.961
10.510
22.472
-7.528
30.000
QUASIPEAK
2
240.000
14.124
18.000
32.124
-4.876
37.000
QUASIPEAK
3
360.000
18.923
8.210
27.133
-9.867
37.000
QUASIPEAK
4
369.780
19.343
9.170
28.513
-8.487
37.000
QUASIPEAK
5
402.000
20.530
5.320
25.850
-11.150
37.000
QUASIPEAK
6
480.010
22.172
10.100
32.272
-4.728
37.000
QUASIPEAK
7
499.990
22.411
7.920
30.331
-6.669
37.000
QUASIPEAK
720.000
25.920
8.000
33.920
-3.080
37.000
QUASIPEAK
9
739.600
26.417
5.530
31.947
-5.053
37.000
QUASIPEAK
10
813.560
27.105
5.960
33.065
-3.935
37.000
QUASIPEAK
11
875.020
27.621
5.150
32.770
-4.230
37.000
QUASIPEAK
8
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 48 of 90
Report No: 06CL025-ITCEP11V04
Site : OATS-3
Time : 2006/12/01 - 15:23
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Media Live
Probe : CBL6112B-(2918) - VERTICAL
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
1
125.000
14.027
2
177.500
3
186.700
4
5
12.500
26.527
-3.473
11.290
7.730
19.020
-10.980
30.000
QUASIPEAK
11.136
12.110
23.246
-6.754
30.000
QUASIPEAK
195.000
11.577
12.910
24.487
-5.513
30.000
QUASIPEAK
216.000
11.388
12.650
24.037
-5.963
30.000
QUASIPEAK
6
240.000
14.124
15.000
29.124
-7.876
37.000
QUASIPEAK
7
250.000
15.286
15.930
31.216
-5.784
37.000
QUASIPEAK
8
360.070
18.926
10.720
29.646
-7.354
37.000
QUASIPEAK
9
369.790
19.344
9.870
29.214
-7.786
37.000
QUASIPEAK
10
QUASIPEAK
480.000
22.172
11.700
33.872
-3.128
37.000
QUASIPEAK
11
499.990
22.411
6.690
29.101
-7.899
37.000
QUASIPEAK
12
517.720
22.875
10.630
33.505
-3.495
37.000
QUASIPEAK
13
591.680
24.236
8.450
32.685
-4.315
37.000
QUASIPEAK
14
625.000
24.704
7.750
32.454
-4.546
37.000
QUASIPEAK
15
720.000
25.920
7.200
33.120
-3.880
37.000
QUASIPEAK
16
887.518
27.773
5.580
33.353
-3.647
37.000
QUASIPEAK
999.980
28.918
5.060
33.978
-3.022
37.000
QUASIPEAK
17
*
30.000
Detector Type
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 49 of 90
Report No: 06CL025-ITCEP11V04
5.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Front View of Radiated Test
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Back View of Radiated Test
Page: 50 of 90
Report No: 06CL025-ITCEP11V04
6. Harmonic Current Emission
6.1. Test Specification
According to EMC Standard : EN 61000-3-2
6.2. Test Setup
6.3. Limit
(a) Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Page: 51 of 90
Report No: 06CL025-ITCEP11V04
(b) Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents
Harmonics Order
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
n
%
2
2
3
30.λ
5
10
7
7
9
5
11 ≤ n ≤ 39
*
3
(odd harmonics only)
*λ is the circuit power factor
(d) Limits of Class D Harmonics Currents
Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11 ≤ n ≤ 39
(odd harmonics only)
Page: 52 of 90
Report No: 06CL025-ITCEP11V04
6.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
6.5. Deviation from Test Standard
No deviation.
Page: 53 of 90
Report No: 06CL025-ITCEP11V04
6.6. Test Result
Product
Media Live
Test Item
Power Harmonics
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/09
Test Site
Test Result: Pass
No.3 Shielded Room
Source qualification: Normal
0.9
300
0.6
200
0.3
100
0.0
0
-0.3
-100
-0.6
-200
-0.9
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.55
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #13 with 27.18% of the limit.
Page: 54 of 90
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No: 06CL025-ITCEP11V04
Test Result: Pass
Source qualification: Normal
THC(A): 0.08
I-THD(%): 21.08
Highest parameter values during test:
V_RMS (Volts): 229.81
I_Peak (Amps): 0.855
I_Fund (Amps): 0.457
Power (Watts):
102.7
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.080
0.000
0.008
0.000
0.007
0.000
0.003
0.000
0.005
0.000
0.009
0.000
0.003
0.000
0.002
0.000
0.004
0.000
0.003
0.000
0.003
0.000
0.004
0.000
0.004
0.000
0.003
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
POHC(A): 0.009
Frequency(Hz):
I_RMS (Amps):
Crest Factor:
Power Factor:
POHC Limit(A): 0.044
50.00
0.470
2.200
0.952
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.349
22.8
0.094
0.524
18.03
Pass
0.195
4.2
0.011
0.287
3.66
Pass
0.103
6.5
0.009
0.154
5.98
Pass
0.051
6.2
0.003
0.073
4.64
Pass
0.036
12.9
0.008
0.054
15.01
Pass
0.031
30.7
0.012
0.043
27.18
Pass
0.027
12.2
0.008
0.040
21.34
Pass
0.024
10.2
0.003
0.035
9.39
Pass
0.021
20.5
0.004
0.027
16.75
Pass
0.019
17.4
0.004
0.027
15.95
Pass
0.017
19.9
0.005
0.026
17.72
Pass
0.016
23.4
0.005
0.024
20.47
Pass
0.015
25.4
0.005
0.022
23.00
Pass
0.014
25.3
0.005
0.020
24.63
Pass
0.013
14.4
0.004
0.019
23.32
Pass
0.012
15.6
0.004
0.018
20.71
Pass
0.011
21.8
0.003
0.015
19.98
Pass
0.011
20.7
0.003
0.015
21.28
Pass
0.010
14.8
0.003
0.015
19.65
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 55 of 90
Report No: 06CL025-ITCEP11V04
6.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Power Harmonics Test Setup
Page: 56 of 90
Report No: 06CL025-ITCEP11V04
7. Voltage Fluctuation and Flicker
7.1. Test Specification
According to EMC Standard : EN 61000-3-3
7.2. Test Setup
7.3. Limit
The following limits apply:
- the value of Pst shall not be greater than 1.0;
- the value of Plt shall not be greater than 0.65;
- the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500
ms;
- the relative steady-state voltage change, dc, shall not exceed 3.3 %;
- the maximum relative voltage change, dmax, shall not exceed;
a) 4 % without additional conditions;
b)
6 % for equipment which is:
- switched manually, or
- switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit.
For example: a dmax of 6%producing a rectangular voltage change characteristic twice per
hour will give a P1t of about 0.65.
Page: 57 of 90
Report No: 06CL025-ITCEP11V04
c)
7 % for equipment which is:
- attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as
electric drills), or
- switched on automatically, or is intended to be switched on manually, no more than
twice per day, and also has either a delayed restart (the delay being not less than a
few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
7.5. Deviation from Test Standard
No deviation.
Page: 58 of 90
Report No: 06CL025-ITCEP11V04
7.6. Test Result
Product
Media Live
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/09
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
3:01:24
Plt
Plt and limit line
0.6
0.5
0.4
0.3
0.2
0.1
3:01:24
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.63
Highest dt (%):
0.30
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.164
Highest Plt (2 hr. period):
0.072
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 59 of 90
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Report No: 06CL025-ITCEP11V04
7.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Flicker Test Setup
Page: 60 of 90
Report No: 06CL025-ITCEP11V04
8. Electrostatic Discharge
8.1. Test Specification
According to Standard : IEC 61000-4-2
8.2. Test Setup
8.3. Limit
Item Environmental
Units
Test Specification
Phenomena
Performance
Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge
±4 Contact Discharge
Page: 61 of 90
B
Report No: 06CL025-ITCEP11V04
8.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
least ten single discharges with positive and negative at the same selected point.
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
least ten single discharges with positive and negative at the same selected point.
8.5. Deviation from Test Standard
No deviation.
Page: 62 of 90
Report No: 06CL025-ITCEP11V04
8.6. Test Result
Product
Media Live
Test Item
Electrostatic Discharge
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/11/08
Item
Amount of
Discharge
Test Site
Voltage
No.6 Shielded Room
Required
Criteria
Complied To
Criteria
Results
(A,B,C)
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
B
Pass
25
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(HCP)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Front)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Left)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Back)
50
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
B
Pass
(VCP Right)
50
-4kV
B
B
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 63 of 90
Report No: 06CL025-ITCEP11V04
8.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: ESD Test Setup
Page: 64 of 90
Report No: 06CL025-ITCEP11V04
9. Radiated Susceptibility
9.1. Test Specification
According to Standard : IEC 61000-4-3
9.2. Test Setup
9.3. Limit
Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port
80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 65 of 90
80
A
Report No: 06CL025-ITCEP11V04
9.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from
antenna to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
∆ f :
1%
1.5 x 10-3 decades/s
9.5. Deviation from Test Standard
No deviation.
Page: 66 of 90
Report No: 06CL025-ITCEP11V04
9.6. Test Result
Product
Media Live
Test Item
Radiated susceptibility
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/09
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
There was no observable degradation in performance.
EUT stopped operation and could / could not be reset by operator at
MHz.
at frequency
No false alarms or other malfunctions were observed during or after the test.
Page: 67 of 90
V/m
Report No: 06CL025-ITCEP11V04
9.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Radiated Susceptibility Test Setup
Page: 68 of 90
Report No: 06CL025-ITCEP11V04
10. Electrical Fast Transient/Burst
10.1. Test Specification
According to Standard : IEC 61000-4-4
10.2. Test Setup
10.3. Limit
Item Environmental
Units
Phenomena
I/O and communication ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input DC Power Ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input AC Power Ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Page: 69 of 90
Test Specification Performance
Criteria
+0.5
5/50
5
B
+0.5
5/50
5
B
+1
5/50
5
B
Report No: 06CL025-ITCEP11V04
10.4. Test Procedure
The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on
the table, and uses a 0.1m insulation between the EUT and ground reference plane.
The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and
projected beyond the EUT by at least 0.1m on all sides.
Test on I/O and communication ports:
The EFT interference signal is through a coupling clamp device couples to the signal and
control lines of the EUT with burst noise for 1minute.
Test on power supply ports:
The EUT is connected to the power mains through a coupling device that directly couples the
EFT/B interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.
The length of the signal and power lines between the coupling device and the EUT is 0.5m.
10.5. Deviation from Test Standard
No deviation.
Page: 70 of 90
Report No: 06CL025-ITCEP11V04
10.6. Test Result
Product
Media Live
Test Item
Electrical fast transient/burst
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/09
Inject
Line
Voltage
Test Site
Inject
Time
Polarity
kV
(Second)
No.2 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L+N+PE
±
1kV
60
CDN
B
A
PASS
LAN
±
0.5kV
90
CDN
B
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
Line
.
No false alarms or other malfunctions were observed during or after the test.
Page: 71 of 90
kV of
Report No: 06CL025-ITCEP11V04
10.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: EFT/B Test Setup
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: EFT/B Test Setup-Clamp
Page: 72 of 90
Report No: 06CL025-ITCEP11V04
11. Surge
11.1. Test Specification
According to Standard : IEC 61000-4-5
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena Units
Test Specification Performance
Criteria
Signal Ports and Telecommunication Ports(See 1) and 2) )
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
±1
Input DC Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
± 0.5
AC Input and AC Output Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
Line to Line
kV
±1
B
Line to Ground
kV
±2
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT, no immunity test shall be required.
Page: 73 of 90
Report No: 06CL025-ITCEP11V04
11.4. Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The length of power cord between the coupling device and the EUT shall
be 2m or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and
the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
11.5. Deviation from Test Standard
No deviation.
Page: 74 of 90
Report No: 06CL025-ITCEP11V04
11.6. Test Result
Product
Media Live
Test Item
Surge
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/09
Inject
Line
Test Site
Voltage
Polarity
Time
Interval
Angle
kV
(Second)
No.2 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
.
Line
No false alarms or other malfunctions were observed during or after the test.
Page: 75 of 90
kV of
Report No: 06CL025-ITCEP11V04
11.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: SURGE Test Setup
Page: 76 of 90
Report No: 06CL025-ITCEP11V04
12. Conducted Susceptibility
12.1. Test Specification
According to Standard : IEC 61000-4-6
12.2. Test Setup
CDN Test Mode
EM Clamp Test Mode
Page: 77 of 90
Report No: 06CL025-ITCEP11V04
12.3. Limit
Item Environmental Phenomena Units
Test
Specification
Signal Ports and Telecommunication Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Input DC Power Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Input AC Power Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
0.15-80
3
80
0.15-80
3
80
0.15-80
3
80
Performance
Criteria
A
A
A
12.4. Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the
table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground
reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for
power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
1. Field Strength
2. Radiated Signal
3. Scanning Frequency
4 Dwell Time
5. Frequency step size
∆ f :
6. The rate of Swept of Frequency
Remarks
130dBuV(3V) Level 2
AM 80% Modulated with 1kHz
0.15MHz – 80MHz
3 Seconds
1%
1.5 x 10-3 decades/s
12.5. Deviation from Test Standard
No deviation.
Page: 78 of 90
Report No: 06CL025-ITCEP11V04
12.6. Test Result
Product
Media Live
Test Item
Conducted susceptibility
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/13
Test Site
No.6 Shielded Room
Result
Frequency
Voltage
Inject
Tested Port
Required
Performance
Range
Applied
Method
of
Criteria
Criteria
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN (GIGA)
A
A
PASS
Complied To
EUT
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
dBuV(V) at
MHz.
frequency
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 79 of 90
Report No: 06CL025-ITCEP11V04
12.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Conducted Susceptibility Test Setup
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Conducted Susceptibility Test Setup-CDN
Page: 80 of 90
Report No: 06CL025-ITCEP11V04
13. Power Frequency Magnetic Field
13.1. Test Specification
According to Standard : IEC 61000-4-8
13.2. Test Setup
13.3. Limit
Item
Environmental
Phenomena
Enclosure Port
Power-Frequency
Magnetic Field
Units
Test Specification Performance
Criteria
Hz
A/m (r.m.s.)
50
1
A
13.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central
of the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
13.5. Deviation from Test Standard
No deviation.
Page: 81 of 90
Report No: 06CL025-ITCEP11V04
13.6. Test Result
Product
Media Live
Test Item
Power frequency magnetic field
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/13
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV
of Line
.
No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Page: 82 of 90
Report No: 06CL025-ITCEP11V04
13.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Power Frequency Magnetic Field Test Setup
Page: 83 of 90
Report No: 06CL025-ITCEP11V04
14. Voltage Dips and Interruption
14.1. Test Specification
According to Standard : IEC 61000-4-11
14.2. Test Setup
14.3. Limit
Item Environmental
Units
Test Specification Performance
Phenomena
Input AC Power Ports
Voltage Dips
Criteria
% Reduction
30
Period
25
% Reduction
Period
Voltage Interruptions
>95
0.5
% Reduction
> 95
Period
250
Page: 84 of 90
C
B
C
Report No: 06CL025-ITCEP11V04
14.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is
large than 20% of lower power range, both end of specified voltage shall be tested.
Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,
for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 250 Periods with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the
voltage.
14.5. Deviation from Test Standard
No deviation.
Page: 85 of 90
Report No: 06CL025-ITCEP11V04
14.6. Test Result
Product
Media Live
Test Item
Voltage dips and interruption
Test Mode
Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Date of Test
2006/12/13
Voltage Dips and
Angle
Interruption
Test Site
Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C
C
C
C
C
C
C
C
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
C
C
C
C
C
C
C
C
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
No.2 Shielded Room
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
The nominal voltage of EUT is 230V.
EUT stopped operation and could / could not be reset by operator at
kV
of Line
.
No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Page: 86 of 90
Report No: 06CL025-ITCEP11V04
14.7. Test Photograph
Test Mode : Mode 1: AMD Athlon 64 Processor 3.8GHz,D-Sub 2048*1536/60Hz+HDMI 1920*1080/60Hz
Description
: Voltage Dips Test Setup
Page: 87 of 90
Report No: 06CL025-ITCEP11V04
15. Attachment
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 88 of 90
Report No: 06CL025-ITCEP11V04
(3) EUT Photo
(4) EUT Photo
Page: 89 of 90
Report No: 06CL025-ITCEP11V04
(5) EUT Photo
Page: 90 of 90