Samsung CL32A476MQJNNNE datasheet

SPECIFICATION
(Reference sheet)
 Samsung P/N : CL32A476MQJNNNE
 Description : CAP, 47㎌, 6.3V, ±20%, X5R, 1210
 Supplier : Samsung electro-mechanics
 Product : Multi-layer Ceramic Capacitor
A. Samsung Part Number
① Series
② Size
CL
32
A
476
M
Q
J
N
N
N
E
①
②
③
④
⑤
⑥
⑦
⑧
⑨
⑩
⑪
Samsung Multi-layer Ceramic Capacitor
1210 (inch code)
③ Dielectric
X5R
④ Capacitance
47 ㎌
±20 %
⑤ Capacitance
L: 3.2 ± 0.3
tolerance
⑥ Rated Voltage
6.3 V
⑦ Thickness
2.5 ± 0.2
mm
mm
2.5
W:
± 0.2
⑧ Inner electrode
Ni
Termination
Cu
Plating
Sn 100%
mm
(Pb Free)
⑨ Product
Normal
⑩ Special
Reserved for future use
⑪ Packaging
Embossed Type, 7" reel
B. Samsung Reliability Test and Judgement condition
Test condition
Performance
120㎐±20%
Capacitance
Tan δ (DF)
Insulation
Within specified tolerance
0.1 max.
0.5±0.1Vrms
*A capacitor prior to measuring the capacitance is heat
treated at 150℃+0/-10℃, and maintained in ambient air
for 24±2 hours.
Rated Voltage
Resistance
10,000Mohm or 100Mohm㎌
Whichever is Smaller
60~120 sec.
Appearance
No abnormal exterior appearance
Withstanding
No dielectric breakdown or
Visual inspection
250% of the rated voltage
Voltage
mechanical breakdown
Temperature
X5R
Characteristics
Adhesive Strength
(From -55℃ to 85℃, Capacitance change should be within ±15%)
No peeling shall be occur on the
500gF, for 10±1 sec.
of Termination
terminal electrode
Bending Strength
Capacitance change :
Solderability
More than 75% of terminal surface
SnAg3.0Cu0.5 solder
is to be soldered newly
245±5℃, 3±0.3sec.
within ±12.5% Bending to the limit (1mm)
with 1.0mm/sec.
(preheating : 80~120℃ for 10~30sec.)
Resistance to
Capacitance change :
Soldering heat
Tan δ, IR : initial spec.
within ±7.5%
Solder pot : 270±5℃, 10±1sec.
Performance
Vibration Test
Capacitance change :
within ±5%
Tan δ, IR : initial spec.
Moisture
Capacitance change :
Resistance
Tan δ : 0.125 max
IR
Amplitude : 1.5mm
From 10㎐ to 55㎐ (return : 1min.)
2hours  3 direction (x, y, z)
within ±12.5% With rated voltage
40±2℃, 90~95%RH, 500+12/-0 hours
: 500Mohm or 12.5 Mohm  ㎌
Whichever is Smaller
High Temperature
Capacitance change :
Resistance
Tan δ : 0.125 max
IR
Test condition
within ±12.5% With 150%
Max. operating temperature
: 1,000Mohm or 25Mohm  ㎌
Whichever is Smaller
Temperature
Capacitance change :
Cycling
Tan δ, IR : initial spec.
of the rated voltage
within ±7.5%
1000+48/-0 hours
1 cycle condition
Min. operating temperature
25℃
→
25℃
→
Max. operating temperature →
5 cycles test
C. Recommended Soldering method :
Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max )
Product specifications included in the specifications are effective as of March 1, 2013.
Please be advised that they are standard product specifications for reference only.
We may change, modify or discontinue the product specifications without notice at any time.
So, you need to approve the product specifications before placing an order.
Should you have any question regarding the product specifications,
please contact our sales personnel or application engineers.