Agilent Technologies 8753ES Technical data

Service Guide
8753ES Option 011
Agilent Technologies
Network Analyzer
Part Number 08753-90485
Printed in USA
June 2004
Supersedes Print Date: June 2002
 Agilent Technologies, Inc. 1999–2002, 2004
WARRANTY STATEMENT
THE MATERIAL CONTAINED IN THIS DOCUMENT IS PROVIDED “AS IS,” AND IS SUBJECT
TO BEING CHANGED, WITHOUT NOTICE, IN FUTURE EDITIONS. FURTHER, TO THE
MAXIMUM EXTENT PERMITTED BY APPLICABLE LAW, AGILENT DISCLAIMS ALL
WARRANTIES, EITHER EXPRESS OR IMPLIED WITH REGARD TO THIS MANUAL AND
ANY INFORMATION CONTAINED HEREIN, INCLUDING BUT NOT LIMITED TO THE
IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR
PURPOSE. AGILENT SHALL NOT BE LIABLE FOR ERRORS OR FOR INCIDENTAL
OR CONSEQUENTIAL DAMAGES IN CONNECTION WITH THE FURNISHING, USE, OR
PERFORMANCE OF THIS DOCUMENT OR ANY INFORMATION CONTAINED HEREIN.
SHOULD AGILENT AND THE USER HAVE A SEPARATE WRITTEN AGREEMENT WITH
WARRANTY TERMS COVERING THE MATERIAL IN THIS DOCUMENT THAT CONFLICT
WITH THESE TERMS, THE WARRANTY TERMS IN THE SEPARATE AGREEMENT WILL
CONTROL.
DFARS/Restricted Rights Notice
If software is for use in the performance of a U.S. Government prime contract or
subcontract, Software is delivered and licensed as “Commercial computer software” as
defined in DFAR 252.227-7014 (June 1995), or as a “commercial item” as defined in FAR
2.101(a) or as “Restricted computer software” as defined in FAR 52.227-19 (June 1987) or
any equivalent agency regulation or contract clause. Use, duplication or disclosure of
Software is subject to Agilent Technologies’ standard commercial license terms, and
non-DOD Departments and Agencies of the U.S. Government will receive no greater than
Restricted Rights as defined in FAR 52.227-19(c)(1-2) (June 1987). U.S. Government users
will receive no greater than Limited Rights as defined in FAR 52.227-14 (June 1987) or
DFAR 252.227-7015 (b)(2) (November 1995), as applicable in any technical data.
Certification
Agilent Technologies, Inc. certifies that this product met its published specifications at the
time of shipment from the factory. Agilent Technologies, Inc. further certifies that its
calibration measurements are traceable to the United States National Institute of
Standards and Technology, to the extent allowed by the Institute's calibration facility, and
to the calibration facilities of other International Standards Organization members.
ii
Assistance
Product maintenance agreements and other customer assistance agreements are available
for Agilent Technologies, Inc. products. For information about these agreements and for
other assistance, contact Agilent. Refer to “Assistance” on page 15-2.
Safety and Regulatory Information
The safety and regulatory information pertaining to this product is located in Chapter 15 ,
“Safety and Regulatory Information.”
Safety Notes
The following safety notes are used throughout this manual. Familiarize yourself with
each of the notes and its meaning before operating this instrument. All pertinent safety
notes for using this product are located in Chapter 15 , “Safety and Regulatory
Information.”
WARNING
Warning denotes a hazard. It calls attention to a procedure which, if
not correctly performed or adhered to, could result in injury or loss
of life. Do not proceed beyond a warning note until the indicated
conditions are fully understood and met.
CAUTION
Caution denotes a hazard. It calls attention to a procedure that, if not
correctly performed or adhered to, could result in damage to or destruction of
the instrument. Do not proceed beyond a caution sign until the indicated
conditions are fully understood and met.
iii
Documentation Map
The Installation and Quick Start Guide provides procedures for
installing, configuring, and verifying the operation of the analyzer. It
also will help you familiarize yourself with the basic operation of the
analyzer.
The User’s Guide shows how to make measurements, explains
commonly-used features, and tells you how to get the most
performance from your analyzer.
The Reference Guide provides reference information, such as
specifications, menu maps, and key definitions.
The Programmer’s Guide provides general GPIB programming
information, a command reference, and example programs. The
Programmer’s Guide contains a CD-ROM with example programs.
The CD-ROM provides the Installation and Quick Start Guide, the
User’s Guide, the Reference Guide, and the Programmer’s Guide in
PDF format for viewing or printing from a PC.
The Service Guide provides information on calibrating,
troubleshooting, and servicing your analyzer. The Service Guide is not
part of a standard shipment and is available only as Option 0BW. A
CD-ROM with the Service Guide in PDF format is included for
viewing or printing from a PC.
How to Use This Guide
This guide uses the following conventions:
Front Panel Key
This represents a key physically located on the
instrument.
SOFTKEY
This represents a “softkey”, a key whose label is
determined by the instrument firmware.
Computer Font
This represents text displayed on the instrument’s screen,
text on a computer display, or a programming command.
iv
Contents
1. Service Equipment and Analyzer Options
Required Tools and Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-2
Principles of Microwave Connector Care . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-5
Analyzer Options Available . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-6
Service and Support Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-7
2. Performance Tests
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-2
1. Source Frequency Range and Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-4
2. Source Power Range, Linearity, and Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-6
3. Receiver Minimum R Channel Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-12
4. External Source Mode Frequency Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-14
5. Receiver Channel Noise Floor Level
(Only for Analyzers without Option 006) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-16
6. Receiver Channel Noise Floor Level
(Only for Analyzers with Option 006) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-19
7. Receiver Magnitude Frequency Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-23
8. Receiver Phase Frequency Response (Ratio) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-27
9. Receiver Input Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-32
10. Receiver Trace Noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-38
11. Receiver Input Impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-42
12. Receiver Magnitude Dynamic Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-48
13. Receiver Magnitude Compression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-58
14. Receiver Phase Compression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-62
15. Source and Receiver Harmonics (Option 002 Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-66
16. Harmonic Measurement Accuracy
(Option 002 Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-70
Performance Test Records . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-73
3. Adjustments and Correction Constants
Post-Repair Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-3
A9 Switch Positions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-6
Source Default Correction Constants (Test 44) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-7
Source Pretune Default Correction Constants (Test 45) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-8
Analog Bus Correction Constants (Test 46) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-9
Source Pretune Correction Constants (Test 48) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-10
RF Output Power Correction Constants (Test 47) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-11
IF Amplifier Correction Constants (Test 51) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-16
ADC Offset Correction Constants (Test 52) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-18
Sampler Magnitude and Phase Correction Constants
(Test 53) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-19
Cavity Oscillator Frequency Correction Constants (Test 54) . . . . . . . . . . . . . . . . . . . . . . . .3-25
Serial Number Correction Constants (Test 55) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-30
Option Numbers Correction Constants (Test 56) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-31
Initialize EEPROMs (Test 58) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-32
EEPROM Backup Disk Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-33
Correction Constants Retrieval Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-34
Loading Firmware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-35
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Contents
Fractional-N Frequency Range Adjustment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-39
Frequency Accuracy Adjustment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-42
High/Low Band Transition Adjustment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-45
Fractional-N Spur Avoidance and FM Sideband Adjustment . . . . . . . . . . . . . . . . . . . . . . . 3-47
Source Spur Avoidance Tracking Adjustment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-50
Unprotected Hardware Option Numbers Correction Constants . . . . . . . . . . . . . . . . . . . . . 3-52
Sequences for Mechanical Adjustments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-53
4. Start Troubleshooting Here
Start Troubleshooting Here . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-2
Assembly Replacement Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-3
Having Your Analyzer Serviced . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-4
Step 1. Initial Observations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-5
Step 2. Operator's Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6
Step 3. GPIB Systems Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-8
Step 4. Faulty Group Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-10
Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-11
Digital Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-12
Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-14
Receiver . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-17
Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-19
5. Power Supply Troubleshooting
Power Supply Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-2
Assembly Replacement Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3
Simplified Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-4
Start Here . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5
If the Green LED of the A15 Is Not ON Steadily . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-7
If the Red LED of the A15 Is ON . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-8
If the Green LEDs of the A8 Are Not All ON . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-13
Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-17
Fan Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-19
Intermittent Problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-20
6. Digital Control Troubleshooting
Digital Control Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Digital Control Group Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-3
Assembly Replacement Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4
CPU Troubleshooting (A9) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5
Display Troubleshooting (A2, A18, A19, A27) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-7
Front Panel Troubleshooting (A1, A2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-12
Run the Internal Diagnostic Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-16
If the Fault Is Intermittent . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-18
GPIB Failures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-19
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Contents
7. Source Troubleshooting
Source Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-2
Assembly Replacement Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-3
Before You Start Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4
Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-5
Phase Lock Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-6
Source Group Troubleshooting Appendix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-30
8. Receiver Troubleshooting
Receiver Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2
Assembly Replacement Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-3
Receiver Failure Error Messages. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-4
Check the R, A, and B Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-5
Troubleshooting When All Inputs Look Bad . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-7
Check the 4 MHz REF Signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-8
Troubleshooting When One or More Inputs Look Good . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-11
9. Accessories Troubleshooting
Accessories Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9-2
Assembly Replacement Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9-3
Inspect the Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9-4
Inspect the Error Terms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9-5
Test Set Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9-8
10. Service Key Menus and Error Messages
Service Key Menus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10-3
GPIB Service Mnemonic Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10-42
Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10-44
11. Error Terms
Error Terms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11-2
Error Terms Can Serve a Diagnostic Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11-3
Full Two-Port Error-Correction Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11-4
12. Theory of Operation
How the Analyzer Works . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-3
A Close Look at the Analyzer's Functional Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-5
Power Supply Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-6
Digital Control Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-9
Source Theory Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-14
Source Super Low Band Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-16
Source Low Band Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-17
Source High Band Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-19
Source Operation in Other Modes/Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-22
Signal Separation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-26
Receiver Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12-28
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Contents
13. Replaceable Parts
Replaceable Parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13-2
Replacing an Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13-3
Rebuilt-Exchange Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13-4
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13-5
Replaceable Part Listings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13-7
14. Assembly Replacement and Post-Repair Procedures
Replacing an Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-3
Line Fuse . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-5
Covers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-6
Front Panel Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-8
Front Panel Keyboard and Interface Assemblies (A1, A2) . . . . . . . . . . . . . . . . . . . . . . . . . 14-10
Display, Display Lamp and Inverter Assemblies
(A18, A27). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-12
Rear Panel Assembly. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-14
Rear Panel Interface Board Assembly (A16) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-16
Type-N Connector Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-18
A3 Source Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-20
A4, A5, A6 Samplers and A7 Pulse Generator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-22
A8, A10, A11, A12, A13, A14 Card Cage Boards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-24
A9 CPU Board . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-26
A9BT1 Battery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-28
A15 Preregulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-30
A17 Motherboard Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-32
A19 Graphics Processor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-35
A20 Disk Drive Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-36
High Stability Frequency Reference (Option 1D5) Assembly . . . . . . . . . . . . . . . . . . . . . . 14-40
B1 Fan Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-42
Post-Repair Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14-43
15. Safety and Regulatory Information
General Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15-2
Instrument Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15-4
Safety Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15-5
Safety Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15-5
Contents-4
1 Service Equipment and Analyzer
Options
1-1
Service Equipment and Analyzer Options
Required Tools and Equipment
Required Tools and Equipment
The following is a list of the tools required to service your analyzer:
• T-8, T-10, T-15, T-20, and T-25 TORX screwdrivers
• Flat-blade screwdrivers — small, medium, and large
• 5/16-inch open-end wrench (for SMA nuts)
• 2-mm extended bit Allen wrench
• 3/16, 5/16, and 9/16-inch hex nut drivers
• 5/16-inch open-end torque wrench (set to 10 in-lb)
• 2.5-mm hex-key driver
• Non-conductive and non-ferrous adjustment tool
• Needle-nose pliers
• Tweezers
• Antistatic work mat with wrist-strap
1-2
Chapter 1
Service Equipment and Analyzer Options
Required Tools and Equipment
Table 1-1
Service Test Equipment
Required Equipment
Critical Specifications
Recommended Model or
HP/Agilent Part Number
Usea
Spectrum Analyzer
Freq. Accuracy ±7 Hz
8563E
A, T
Frequency Counter
Frequency: 300 kHz–3 GHz
(6 GHz for Option 006)
5350B/51B/52B
P
Synthesized Sweeper
Maximum spurious input: <−30 dB
Residual FM: <20 kHz
83620A
P
Oscilloscope
Bandwidth: 100 MHz
Accuracy: 10%
any
T
Digital Voltmeter
Resolution: 10 mV
any
T
436A/437B/438A,
E4418A/B or E4419A/B
A, P, T
Power Meter (GPIB)
Power Sensor
Frequency: 300 kHz–3 GHz, 50Ω
8482A
A, P, T
Power Sensor
(for Option 006)
Frequency: 3 GHz–6 GHz
8481A
A, P, T
S-Parameter Test Set
Frequency Range: 300 kHz–3 GHz
for Option 006: 3 GHz–6 GHz
85046A
85047A
P
Transmission/Reflection
Test Set
Frequency Range: 300 kHz–3 GHz
Directivity: 30 dB
85044A
P
Tool Kit
No substitute
08753-60023
T
Photometer
Tektronix J16
T
Photometer Probe
Tektronix J6503
T
Light Occluder
Tektronix 016-0305-00
T
Printer
HP ThinkJet, DeskJet,
LaserJet
P
Floppy Disk
one 3.5-inch formatted 1.44 MB
any
A
Calibration Kit 7 mm, 50Ω
No substitute
85031B
P
Calibration Kit Type-N, 50Ω
No substitute
85032B
P
Step Attenuator
No substitute
8496A Opt. 003, H18
P
Fixed Attenuator
Type-N, 3 dB
8491A Opt. 003
P
Fixed Attenuator (2)
Type-N, 20 dB
8491A Opt. 020
A,P, T
Fixed Attenuator
Type-N, 10 dB
8491A Opt. 010
A,P
Fixed Attenuator
Type-N, 30 dB
8491A Opt. 030
A,P
RF Cable Set
12-inch, phase-matched
11500B
A
RF Cable Kit
Type-N, 50Ω, phase-matched
11851B
A, P
RF Cable
24-inch, APC-7, 50 Ω
8120-4779
P
Chapter 1
1-3
Service Equipment and Analyzer Options
Required Tools and Equipment
Table 1-1
Service Test Equipment
Required Equipment
Critical Specifications
Recommended Model or
HP/Agilent Part Number
Usea
RF Cable (3)
24-inch, Type-N, 50 Ω
8120-4781
P
RF Cable
50Ω, 7-mm, 24-inch, phase-matched
11857D
P
GPIB Cable
10833A/B/C/D
A, P
BNC Cable
8120-1840
A, P
Low Pass Filter
>50 dB @ 2.96 Hz and passband that
includes 800 MHz
9135-0198
A
Power Splitter (2), 2-way
Type-N
11667A, Option 001
A, P
Minimum Loss Pad
Type-N, 50Ω to 75Ω
11852B
P
Adapter
APC-7 to Type-N (f)
11524A
A
Adapter
APC-7 to Type-N (m)
11525A
P
Adapter
APC-7 to 3.5 mm (m)
1250-1746
A, P
Adapter
BNC to Alligator Clip
8120-1292
A
Adapter
APC-3.5 (f) to Type-N (f)
1250-1745
P
Adapter
Type-N (m) to SMA (f)
1250-1250
A
Adapter
Type-N (m) to SMA (m)
1250-1562
A
Adapter
Type-N (f) to Type-N (f)
1250-1472
A, P
Adapter
Type-N (m) to Type-N (m)
1250-1475
A, P
Adapter
Type-N (f) to BNC (m)
1250-0077
P
Termination (2)
50W, Type-N (m)
Return loss: ≥30 dB
909F, Option 012
P
Antistatic Wrist Strap
9300-1367
A, P, T
Antistatic Wrist Strap Cord
9300-0980
A, P, T
Antistatic Table Mat
9300-0797
A, P, T
a. P = Performance Tests, A = Adjustments, T = Troubleshooting
1-4
Chapter 1
Service Equipment and Analyzer Options
Principles of Microwave Connector Care
Principles of Microwave Connector Care
Proper connector care and connection techniques are critical for accurate, repeatable
measurements.
Refer to the calibration kit documentation for connector care information. Prior to making
connections to the network analyzer, carefully review the information about inspecting,
cleaning, and gaging connectors.
Having good connector care and connection techniques extends the life of these devices. In
addition, you obtain the most accurate measurements.
For additional connector care instruction, contact the nearest Agilent Technologies sales or
service office about course numbers HP/Agilent 85050A+24A and 85050A+24D.
See the following table for quick reference tips about connector care.
Table 1-2
Connector Care Quick Reference
Handling and Storage
Do
Keep connectors clean
Do Not
Extend sleeve or connector nut
Touch mating-plane surfaces
Set connectors contact — end down
Use plastic end-caps during
storage
Visual Inspection
Do
Inspect all connectors carefully
Do Not
Use a damaged connector — ever
Look for metal particles, scratches,
and dents
Connector Cleaning
Do
Try compressed air first
Do Not
Use isopropyl alcohol
Use any abrasives
Get liquid into plastic support
beads
Clean connector threads
Gaging Connectors
Do
Clean and zero the gage before use
Do Not
Use an out-of-spec connector
Use the correct gage type
Use correct end of calibration block
Gage all connectors before first use
Making Connections
Do
Chapter 1
Align connectors carefully
Do Not
Apply bending force to connection
Make preliminary connection
lightly
Over tighten preliminary
connection
Turn only the connector nut
Twist or screw any connection
Use a torque wrench for final
connect
Tighten past torque wrench
“break” point
1-5
Service Equipment and Analyzer Options
Analyzer Options Available
Analyzer Options Available
Option 1D5, High Stability Frequency Reference
This option offers ±0.05 ppm temperature stability from 0 to 60 °C (referenced to 25 °C).
Option 002, Harmonic Mode
This option provides measurement of second or third harmonics of the test device's
fundamental output signal. Frequency and power sweep are supported in this mode.
Harmonic frequencies can be measured up to the maximum frequency of the receiver.
However, the fundamental frequency may not be lower than 16 MHz.
Option 006, 6 GHz Operation
This option extends the maximum source and receiver frequency of the analyzer to 6 GHz.
Option 010, Time Domain
This option displays the time domain response of a network by computing the inverse
Fourier transform of the frequency domain response. It shows the response of a test device
as a function of time or distance. Displaying the reflection coefficient of a network versus
time determines the magnitude and location of each discontinuity. Displaying the
transmission coefficient of a network versus time determines the characteristics of
individual transmission paths. Time domain operation retains all accuracy inherent with
the correction that is active in of such devices as SAW filters, SAW delay lines, RF cables,
and RF antennas.
Option 1CM, Rack Mount Flange Kit without Handles
This option is a rack mount kit containing a pair of flanges and the necessary hardware to
mount the instrument, with handles detached, in an equipment rack with 482.6 mm
(19 inches) horizontal spacing.
Option 1CP, Rack Mount Flange Kit with Handles
This option ia a rack mount kit containing a pair of flanges and the necessary hardware to
mount the instrument with handles attached in an equipment rack with 482.6 mm
(19 inches) spacing.
1-6
Chapter 1
Service Equipment and Analyzer Options
Service and Support Options
Service and Support Options
The analyzer’s standard warranty is a one-year return to Agilent Technologies service
warranty.
NOTE
Chapter 1
There are many other repair and calibration options available from the
Agilent Technologies support organization. These options cover a range of
service agreements with varying response times. Contact Agilent for
additional information on available service agreements for this product. Refer
to “Contacting Agilent” on page 15-3.
1-7
Service Equipment and Analyzer Options
Service and Support Options
1-8
Chapter 1
2 Performance Tests
2-1
Performance Tests
Introduction
Introduction
The performance of the analyzer is verified by confirming that the analyzer’s output and
input behavior meets the instrument specifications. The instrument specifications are
found in the chapter titled “Specifications and Characteristics” in the analyzer’s reference
guide.
The section on instrument specifications is divided into two parts:
• Source Specifications
• Receiver Specifications
The performance tests documented in this chapter are used to test the analyzer’s
performance against the instrument specifications. If the analyzer passes the performance
tests, it meets the instrument specifications. Following is the list of performance tests.
1. Source Frequency Range and Accuracy on page 2-4
2. Source Power Range, Linearity, and Accuracy on page 2-6
3. Receiver Minimum R Channel Level on page 2-12
4. External Source Mode Frequency Range on page 2-14
5. Receiver Channel Noise Floor Level (Only for Analyzers without Option 006) on
page 2-16
6. Receiver Channel Noise Floor Level (Only for Analyzers with Option 006) on
page 2-19
7. Receiver Magnitude Frequency Response on page 2-23
8. Receiver Phase Frequency Response (Ratio) on page 2-27
9. Receiver Input Crosstalk on page 2-32
10. Receiver Trace Noise on page 2-38
11. Receiver Input Impedance on page 2-42
12. Receiver Magnitude Dynamic Accuracy on page 2-48
13. Receiver Magnitude Compression on page 2-58
14. Receiver Phase Compression on page 2-62
15. Source and Receiver Harmonics (Option 002 Only) on page 2-66
16. Harmonic Measurement Accuracy (Option 002 Only) on page 2-70
2-2
Chapter 2
Performance Tests
Introduction
Performance Test Records
Performance test records for each of the performance tests can be found at the end of this
chapter. It is recommended that you use photocopies of the test records to record test
results on.
Certificate of Calibration
Agilent Technologies will issue a Certificate of Calibration for the product upon successful
completion of the performance tests. The equipment and measurement standards used for
the test must be certified and must be traceable to recognized standards.
NOTE
Chapter 2
If you have a measurement application that does not use all of the
measurement capabilities of the analyzer, you may ask your local Agilent
Technologies service center to verify only a subset of the specifications.
However, this creates the possibility of making inaccurate measurements if
you then use the analyzer in an application requiring additional capabilities.
2-3
Performance Tests
1. Source Frequency Range and Accuracy
1. Source Frequency Range and Accuracy
Perform this test to verify the frequency accuracy of the analyzer over its entire operating
frequency range. A frequency counter is used to determine the analyzer’s output frequency.
Analyzer warm-up time: 30 minutes
Specifications
Frequency Range
Frequency Accuracya
300 kHz to 3 GHz
±10 ppm
30 kHz to 6 GHzb
±10 ppm
a. At 25 °C ±5 °C.
b. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
Frequency Counter
5350B/51B/52B
RF cable set, 50Ω type-N
11851B
2-way power splitter, 50Ω
11667A Option 001
Adapter, type-N (f) to BNC (m)
1250-0077
Procedure
1. Connect the equipment as shown in Figure 2-1.
2-4
Chapter 2
Performance Tests
1. Source Frequency Range and Accuracy
Figure 2-1
Source Frequency Range and Accuracy Test Setup
2. Press Preset
Sweep Setup
CW FREQ .
3. Press 300 k/m (or 30
k/m if the analyzer has Option 006) and write the
frequency counter reading on the performance test record.
4. Repeat step 3 for each frequency listed in the performance test record.
In Case of Difficulty
1. If any measured frequency is close to the specification limits, check the time base
accuracy of the counter used.
2. If the analyzer fails by a significant margin at all frequencies (especially if the deviation
increases with frequency), the master time-base probably needs adjustment. In this
case, refer to “Frequency Accuracy Adjustment” on page 3-42. The “Fractional-N
Frequency Range Adjustment” on page 3-39 can also affect the frequency accuracy.
3. Refer to Chapter 7 , “Source Troubleshooting,” for related troubleshooting information.
Chapter 2
2-5
Performance Tests
2. Source Power Range, Linearity, and Accuracy
2. Source Power Range, Linearity, and Accuracy
Perform this test to verify the power range and linearity at different CW frequencies
throughout the analyzer operating frequency range.
Analyzer warm-up time: 30 minutes
Specifications
Power Range
Power Level Accuracya
Specification
±1.0 dB
Power Level Linearityb
−5 to +15 dBm
±0.25 dB
+15 to +20 dBm
±0.5 dB
Option 006:c
−5 to +13 dBm
±0.25 dB
+13 to +18 dBm
±0.5 dB
a. At 25 °C ±5 °C, and at +10 dBm output level.
b. At 25 °C ±5 °C, relative to +10 dBm output level.
c. Only for analyzers with Option 006 (6 GHz frequency
extension).
Required Equipment
Description
HP/Agilent Model Number
Power Meter
436A/437B/438A or E4418B/4419B
Power Sensor
8482A
2-way power splitter (2), 50Ω
11667A Option 001
Attenuator (2), 20 dB
8491A Option 020
RF cable set, 50Ω type-N
11851B
Additional Equipment for Option 006 Analyzers
Power Sensor
2-6
8481A
Chapter 2
Performance Tests
2. Source Power Range, Linearity, and Accuracy
Procedure
Path Loss Calibration
1. Connect the equipment as shown in Figure 2-2.
Figure 2-2
Path Loss Calibration Test Setup (#1)
2. Zero and calibrate the power meter. Also set the power meter for dBm. For more
information on how to perform this task, refer to the power meter documentation.
3. Press Preset
Power
10
x1 .
4. Press Sweep Setup CW FREQ 300 k/m . Set the power meter calibration factor for
this CW frequency (except if you are using an HP/Agilent 436A).
5. Write the power meter reading in the “First Value” column on the performance test
record.
6. Repeat steps 4 and 5 for the other CW frequencies listed on the performance test record.
7. Connect the equipment as shown in Figure 2-3.
Chapter 2
2-7
Performance Tests
2. Source Power Range, Linearity, and Accuracy
Figure 2-3
Path Loss Calibration Test Setup (#2)
8. Press Sweep Setup
this CW frequency.
CW FREQ
300
k/m . Set the power meter calibration factor for
9. Write the power meter reading in the “Second Value” column on the performance test
record.
10.Calculate the path loss through the power splitter with this formula:
First Value − Second Value = Path Loss
11.Write the result on the performance test record.
12.Repeat steps 8 through 11 for the other CW frequencies listed on the performance test
record.
2-8
Chapter 2
Performance Tests
2. Source Power Range, Linearity, and Accuracy
Power Range and Power Linearity
13.Connect the equipment as shown in Figure 2-4.
Figure 2-4
Power Range, Linearity, and Accuracy Test Setup
14.Press Preset
Sweep Setup
factor for this CW frequency.
CW FREQ
300
k/m . Set the power meter calibration
15.Press Power
10
x1 . On the power meter, set the current power level as the
reference for relative power (dB) measurements. This can be done by either pressing
dB REL on an HP/Agilent 436A or REL on a 438A power meter front panel.
16.Press Power
−5
x1 . Write the power meter reading in the “Measured Value”
column on the performance test record.
17.With the power offset value that is listed in the performance test record, calculate the
power linearity using this formula:
Power Linearity = [Power Offset] + [Measured Value]
18.Write the result of your calculation on the performance test record.
19.Repeat steps 16 through 18 for the other source power levels listed on the performance
test record.
20.Press Sweep Setup
CW FREQ
3
G/n .
21.Press Power
10
x1 . Set the power meter calibration factor for the selected CW
frequency. Press the appropriate hardkey (dB REL or REL) on the 436A/438A power
meter front panel for relative power measurements.
22.Press Power
−5
x1 . Write the power meter reading in the “Measured Value”
column on the performance test record.
Chapter 2
2-9
Performance Tests
2. Source Power Range, Linearity, and Accuracy
23.With the power offset value listed in the performance test record, calculate the source
power level linearity using this formula:
Power Linearity = [Power Offset] + [Measured Value]
24.Write the result of your calculation on the performance test record.
25.Repeat steps 21 through 24 for the other power levels listed on the performance test
record.
For Analyzers with Option 006
26.Press Sweep Setup
CW FREQ
6
G/n .
27.Repeat steps 21 through 24 for the other power levels listed on the performance test
record.
Power Level Accuracy
28.Press Power
10
29.Press Sweep Setup
this CW frequency.
x1 .
CW FREQ
300
k/m . Set the power meter calibration factor for
30.On the performance test record, copy the “Path Loss” value, previously calculated for
this CW frequency, into the “Path Loss” column.
31.Calculate the calibrated source power level using this formula:
Calibrated Power Level = 10 − Path Loss
32.Write the result in the “Calibrated Power Level” column.
33.Set the power meter for absolute power measurement.
34.Write the power meter reading under the “Measured Value” column on the performance
test record.
35.Calculate the power level accuracy using this formula:
Calibrated Power Level − Measured Value = Power level Accuracy
36.Write this value on the performance test record.
37.Repeat steps 29 through 35 for the other CW frequencies listed on the performance test
record.
2-10
Chapter 2
Performance Tests
2. Source Power Range, Linearity, and Accuracy
In Case of Difficulty
1. Ensure that the power meter and power sensor are operating to specification.
2. Inspect the power splitter connectors. Poor match at these connections can generate
power reflections that can cause the analyzer to appear to be out of specification.
3. Inspect the analyzer RF OUT connector for damage.
4. If any test fails, perform “RF Output Power Correction Constants (Test 47)” on
page 3-11.
5. For a source failure, refer to Chapter 7 , “Source Troubleshooting,” for troubleshooting
information.
Chapter 2
2-11
Performance Tests
3. Receiver Minimum R Channel Level
3. Receiver Minimum R Channel Level
Perform this test to verify the minimum R channel input power level at which phase lock
can be accomplished.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Minimum R Channel Level
300 kHz–3 GHz
−35 dBm
3 GHz–6 GHza
−30 dBm
a. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
Cable Type-N (m) to Type-N (m) 24-inch
11500B
Attenuator, 30 dB
8491A Option 030
Procedure
1. Connect the equipment as shown in Figure 2-5.
Figure 2-5
2-12
Receiver Minimum R Channel Level Test Setup
Chapter 2
Performance Tests
3. Receiver Minimum R Channel Level
2. Press Preset
R.
Meas
3. Press Marker Search TRACKING ON SEARCH:MAX to locate the maximum value
of the R channel input signal.
4. Press Power
−10
5. Press Sweep Setup
x1 .
CW FREQ
300
k/m .
6. Check the analyzer display for phase lock error messages:
• If you do not observe a phase lock error message, write the marker value readout
(which appears in the analyzer display) in the performance test record.
• If you do observe a phase lock error message:
a. Press Power
to increase the power by 1 dBm.
b. Check the analyzer for phase lock error messages.
c. If the analyzer still doesn't phase lock, continue increasing the source output
power until phase lock is achieved.
d. Write the marker value in the performance test record.
• Repeat steps 5 and 6 for the other CW frequencies listed on the performance test
record.
In Case of Difficulty
1. Check the flexible RF cable between the R sampler assembly and the A11 phase lock
assembly. Make sure it is connected between A11J1 (PL IF IN) and 1st IF Out.
2. Use an ohmmeter to verify that the RF cable is not open. In addition, examine both the
cable connectors — measure the resistance between the cable center pin and the cable
connector. The ohmmeter should display a high resistance reading.
3. Check the R sampler by substituting it with the A sampler and rerun the test:
a. Move cable W8 to the A sampler.
b. Use a 10 dB attenuator between the RF OUT and input A.
c. Repeat the test.
d. Select the A sampler by pressing Meas
A in step 2.
e. If the test fails, replace the A11 assembly.
4. Verify that the high/low band adjustments are still within specifications. For more
information on how to perform this task, refer to “High/Low Band Transition
Adjustment” on page 3-45.
5. Refer to Chapter 7 , “Source Troubleshooting,” for troubleshooting information.
Chapter 2
2-13
Performance Tests
4. External Source Mode Frequency Range
4. External Source Mode Frequency Range
Perform this test to verify proper phase lock for selected test frequencies in the external
source mode, at the specified minimum R input level of −25 dBm.
Analyzer warmup time: 30 minutes
Specifications
Frequency Rangea
300 kHz–3 GHz
3 GHz–6 GHzb
a. At −25 dBm R input level.
b. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
External source
83620A
Attenuator, 10 dB
8491A Option 010
Attenuator, 20 dB
8491A Option 020
Cable, 50 Ω type-N
11851B
Adapter, APC-3.5 (f) to type-N (f)
1820-1745
Procedure
1. Connect the equipment as shown in Figure 2-6.
2-14
Chapter 2
Performance Tests
4. External Source Mode Frequency Range
Figure 2-6
External Source Mode Frequency Range Test Setup
2. Preset the external source, and set the power level to 4 dBm, and the CW frequency to
10 MHz.
3. On the network analyzer, press Preset
System
INSTRUMENT MODE
Sweep Setup CW FREQ 10
M/µ
EXT SOURCE AUTO to set up the analyzer for an
external source input to the receiver channel R.
4. Press Meas
R.
5. Press Marker Search TRACKING ON SEARCH:MAX to observe the maximum value
of the receiver R input signal. The analyzer marker 1 reading should be ≤ −25 dBm. If
this is not the case, adjust the output power of the external source to achieve this
condition.
6. Check to see if the analyzer is phase-locking to the external CW signal.
• If the analyzer displays any phase lock error-messages, write “UNLOCK” in the
performance test record for the set CW signal.
• If the analyzer does not display any phase lock error-messages, write “LOCK” in the
performance test record for the set CW signal.
7. On the external source, set the CW frequency to 20 MHz.
8. On the network analyzer, press Sweep Setup
CW FREQ
20
M/µ .
9. Repeat steps 7 and 8 for the CW frequencies listed on the performance test record.
In Case of Difficulty
1. Check the R sampler assembly by substituting it with the A sampler assembly.
2. Move the flexible RF cable (currently connected to the R sampler assembly) to the A
sampler assembly.
3. Use a 10 dB attenuator between the RF OUT and the analyzer receiver input A.
4. Repeat the test. In step 4, press Meas
A.
5. If the test still fails, suspect the A11 phase lock board assembly.
Chapter 2
2-15
Performance Tests
5. Receiver Channel Noise Floor Level (Only for Analyzers without Option 006)
5. Receiver Channel Noise Floor Level
(Only for Analyzers without Option 006)
Perform this test to determine the analyzer receiver channel noise floor levels.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Receiver
Input
IF Bandwidth
Average Noise
Level
300 kHz–3.0 GHz
A
3 kHz
−90 dBm
300 kHz–3.0 GHz
A
10 Hz
−110 dBm
300 kHz–3.0 GHz
B
3 kHz
−90 dBm
300 kHz–3.0 GHz
B
10 Hz
−110 dBm
Required Equipment
Description
HP/Agilent Part or Model Number
Attenuator, 20 dB
8491A Option 020
Termination (2), 50Ω
909F Option 012a
Cable, 50Ω type-N 24-inch
Part of the 11851B cable set
a. Or use the terminations included in the 85032B calibration kit.
Procedure
1. Connect the equipment as shown in Figure 2-7.
2-16
Chapter 2
Performance Tests
5. Receiver Channel Noise Floor Level (Only for Analyzers without Option 006)
Figure 2-7
Receiver Channel Noise Floor Level Test Setup
2. Press Preset
−10
Power
x1 .
Receiver Channel A Noise Floor Level with 3 kHz IF BW
3. Press Meas
A
Format
4. Press Marker Fctn
TRIGGER MENU
LIN MAG
Scale Ref
MARKER MODE MENU
SINGLE .
AUTO SCALE .
MKR STATS ON
Sweep Setup
5. When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
6. Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
7. Write this calculated value in the performance test record in dBm.
Receiver Channel A Noise Floor Level with 10 Hz IF BW
8. Press Avg
IF BW
9. Press Sweep Setup
10
x1 to change the IF bandwidth to 10 Hz.
TRIGGER MENU
SINGLE .
10.When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
11.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
12.Write this calculated value in the performance test record in dBm.
Chapter 2
2-17
Performance Tests
5. Receiver Channel Noise Floor Level (Only for Analyzers without Option 006)
Receiver Channel B Noise Floor Level with 10 Hz IF BW
13.Press Meas
B
Format
14.Press Sweep Setup
LIN MAG .
TRIGGER MENU
SINGLE .
15.When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
16.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
17.Write this calculated value in the performance test record in dBm.
Receiver Channel B Noise Floor Level with a 3 kHz IF BW
18.Press Avg
IF BW
19.Press Sweep Setup
3
k/m to change the IF bandwidth to 3 kHz.
TRIGGER MENU
SINGLE .
20.When the analyzer finishes the sweep, record the mean value, which appears on the
analyzer display.
21.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
22.Write this calculated value in the performance test record in dBm.
In Case of Difficulty
1. Perform “ADC Offset Correction Constants (Test 52)” on page 3-18.
2. Suspect the A10 digital IF assembly if both receiver channels fail.
3. Refer to Chapter 8 , “Receiver Troubleshooting,” for troubleshooting information.
2-18
Chapter 2
Performance Tests
6. Receiver Channel Noise Floor Level (Only for Analyzers with Option 006)
6. Receiver Channel Noise Floor Level
(Only for Analyzers with Option 006)
Perform this test to determine the analyzer's receiver channel noise floor levels.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Receiver Input
IF Bandwidth
Average Noise Level
300 kHz–3.0 GHz
A
3 kHz
−90 dBm
300 kHz–3.0 GHz
A
10 Hz
−110 dBm
300 kHz–3.0 GHz
B
3 kHz
−90 dBm
300 kHz–3.0 GHz
B
10 Hz
−110 dBm
3.0 GHz–6.0 GHz
A
3 kHz
−85 dBm
3.0 GHz–6.0 GHz
A
10 Hz
−105 dBm
3.0 GHz–6.0 GHz
B
3 kHz
−85 dBm
3.0 GHz–6.0 GHz
B
10 Hz
−105 dBm
Required Equipment
Description
HP/Agilent Part or Model Number
Attenuator, 20 dB
8491A Option 020
Termination (2), 50Ω
909F Option 012a
Cable, 50Ω type-N, 24-inch
Part of the 11851B Cable Set
a. Or use the terminations included in the 85032B calibration kit.
Procedure
1. Connect the equipment as shown in Figure 2-8.
Chapter 2
2-19
Performance Tests
6. Receiver Channel Noise Floor Level (Only for Analyzers with Option 006)
Figure 2-8
Receiver Channel Noise Floor Level Test Setup
2. Press Preset
Start
50
k/m
Stop
3
G/n
Power
−10
x1 .
Channel A Noise Floor Level for 3 kHz IF BW (300 kHz–3 GHz)
3. Press Meas
A
Format
4. Press Marker Fctn
TRIGGER MENU
LIN MAG
Scale Ref
MARKER MODE MENU
SINGLE .
AUTO SCALE .
MKR STATS ON
Sweep Setup
5. When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
6. Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
7. Write this calculated value in the performance test record in dBm.
Channel A Noise Floor Level for 10 Hz IF BW (300 kHz–3 GHz)
8. Press Avg
IF BW
9. Press Sweep Setup
10
x1 to change the IF bandwidth to 10 Hz.
TRIGGER MENU
SINGLE .
10.When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
11.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
12.Write this calculated value in the performance test record in dBm.
2-20
Chapter 2
Performance Tests
6. Receiver Channel Noise Floor Level (Only for Analyzers with Option 006)
Channel B Noise Floor Level for 10 Hz IF BW (300 kHz–3 GHz)
13.Press Meas
B
Format
14.Press Sweep Setup
LIN MAG .
TRIGGER MENU
SINGLE .
15.When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
16.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
17.Write this calculated value in the performance test record in dBm.
Channel B Noise Floor Level with 3 kHz IF BW (300 kHz–3 GHz)
18.Press Avg
IF BW
19.Press Sweep Setup
3
k/m to change the IF bandwidth to 3 kHz.
TRIGGER MENU
SINGLE .
20.When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
21.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
22.Write this calculated value in the performance test record in dBm.
Channel B Noise Floor Level with 3 kHz IF BW (3 GHz–6 GHz)
23.Press Start
3
G/n
24.Press Sweep Setup
Stop
6
G/n .
TRIGGER MENU
SINGLE .
25.When the analyzer finishes the sweep, record the mean value which appears on the
analyzer display.
26.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
27.Write this calculated value in the performance test record in dBm.
Channel B Noise Floor Level with 10 Hz IF BW (3 GHz–6 GHz)
28.Press Avg
IF BW
29.Press Sweep Setup
10
x1 to change the IF bandwidth to 10 Hz.
TRIGGER MENU
SINGLE .
30.When the analyzer finishes the sweep, write the mean value, which appears on the
analyzer display.
Chapter 2
2-21
Performance Tests
6. Receiver Channel Noise Floor Level (Only for Analyzers with Option 006)
31.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
32.Write this calculated value in the performance test record in dBm.
Channel A Noise Floor Level with 10 Hz IF BW (3 GHz–6 GHz)
33.Press Meas
A.
34.Press Sweep Setup
TRIGGER MENU
SINGLE .
35.When the analyzer finishes the sweep, record the mean value, which appears on the
analyzer display.
36.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
37.Write this calculated value in the performance test record in dBm.
Channel A Noise Floor Level with 3 kHz IF BW (3 GHz–6 GHz)
38.Press Avg
IF BW
39.Press Sweep Setup
3
k/m .
TRIGGER MENU
SINGLE .
40.When the analyzer finishes the sweep, notice the mean value, which appears on the
analyzer display.
41.Use the following equation to convert the linear magnitude mean value to log
magnitude:
Power (dBm) = 20 × [log10(linear magnitude mean value)]
42.Write this calculated value in the performance test record in dBm.
In Case of Difficulty
1. Perform “ADC Offset Correction Constants (Test 52)” on page 3-18.
2. Suspect the A10 digital IF assembly if both receiver channels fail.
3. Refer to Chapter 8 , “Receiver Troubleshooting,” for troubleshooting information.
2-22
Chapter 2
Performance Tests
7. Receiver Magnitude Frequency Response
7. Receiver Magnitude Frequency Response
Perform this test to verify how well the analyzer transfers information from the RF to IF,
and how accurately it processes and displays that information.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Magnitude Frequency Responsea
300 kHz–3 GHz
± 1 dB
3 GHz–6 GHzb
± 2 dB
a. At 25 °C ± 5 °C; A, B, R, −10 dBm input.
b. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
Power Meter
436A/437B/438A or E4418B/4419B
Power Sensor
8482A
2-Way power splitter, 50Ω
11667A Option 001
Attenuator, 10 dB
8491A Option 010
RF cable set, 50Ω type-N
11851B
Adapter, type-N (m) to type-N (m)
1250-1475
Adapter, type-N (f) to type-N (f)
1250-1472
Additional Equipment for Option 006 Analyzers
Power Sensor
8481A
Procedure
Input R Magnitude Frequency Response
1. Connect the equipment as shown in Figure 2-9.
Chapter 2
2-23
Performance Tests
7. Receiver Magnitude Frequency Response
Figure 2-9
Magnitude Frequency Response Test Setup (Receiver Input R)
2. Zero and calibrate the power meter. Set it to measure dBm.
3. Press Preset
Marker
Meas
4. Press Sweep Setup CW FREQ
meter for this CW frequency.
R
Power
300
6
x1 .
k/m . Set the calibration factor on the power
5. Write the power meter reading on the performance test record.
6. Write the marker reading, which appears on the analyzer display, in the “R Input
Power” column of the performance test record.
7. Repeat steps 4, 5 and 6 for the other CW frequencies listed on the performance test
record.
Input A Magnitude Frequency Response
8. Connect the equipment as shown in Figure 2-10.
2-24
Chapter 2
Performance Tests
7. Receiver Magnitude Frequency Response
Figure 2-10
Magnitude Frequency Response Test Setup (Receiver Input A)
9. Press Meas
A
10.Press CW FREQ
Sweep Setup
300
to measure the power at the receiver input A channel.
k/m .
11.Write the marker reading in the “A Input Power” column on the performance test
record.
12.Repeat steps 10 and 11 for the other CW frequencies listed on the performance test
record.
Input B Magnitude Frequency Response
13.Reconfigure the equipment as shown in Figure 2-11.
Figure 2-11
Chapter 2
Magnitude Frequency Response Test Setup (Receiver Input B)
2-25
Performance Tests
7. Receiver Magnitude Frequency Response
14.Press Meas
B to start measuring the power delivered to receiver input B.
15.Press Sweep Setup
CW FREQ
300
k/m .
16.Write the marker reading in the “B Input Power” column on the performance test
record.
17.Repeat steps 15 and 16 for the other CW frequencies listed on the performance test
record.
18.For each CW frequency, determine which channel input reading shows the greatest
difference:
• power meter versus R
• power meter versus A
• power meter versus B
Refer to the first line for an example listed in the performance test record. Write the
greatest difference in the space provided on the performance test record.
NOTE
The final results represent the worst case magnitude frequency response for
all the analyzer receiver inputs at the selected frequencies.
In Case of Difficulty
1. Suspect poor tracking between the ports of the power splitter if all receiver inputs fail.
Try to repeat the test with another power splitter.
2. Suspect source drift if receiver inputs A and B fail this test at any frequency. Connect
the equipment as shown in Figure 2-10 (or Figure 2-11); set the analyzer source power
at the frequency of interest. Repeat the test for the receiver input(s) that failed before.
3. Perform “Sampler Magnitude and Phase Correction Constants (Test 53)” on page 3-19.
Repeat this performance test.
4. Consult Chapter 8 , “Receiver Troubleshooting,” for troubleshooting information.
2-26
Chapter 2
Performance Tests
8. Receiver Phase Frequency Response (Ratio)
8. Receiver Phase Frequency Response (Ratio)
Perform this test to determine the phase tracking frequency response for each pair of
inputs (A/R, B/R and A/B) in the swept sweep mode.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Phase Frequency Responsea, b
300 kHz–3 GHz
± 3°
3 GHz–6 GHzc
± 10°
a. Deviation from linear phase. IF BW ≤ 300 Hz and 3 second
sweeptime for A/B measurements.
b. At 25 °C ± 5 °C, with −10 dBm into all receiver inputs.
c. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
2-way power splitter (2), 50Ω
11667A, Option 001
RF cable set, 50Ω Type-N
11851B
RF cable, 50Ω Type-N
8120-4781
50 Ω Termination
from 85032B Type-N calibration kit
Procedure
A/R Phase Frequency Response
1. Connect the equipment as shown in Figure 2-12 with the second type-N cable from the
RF cable set connected to port A.
Chapter 2
2-27
Performance Tests
8. Receiver Phase Frequency Response (Ratio)
Figure 2-12
Phase Frequency Response Test Setup
From 300 kHz to 3 GHz
2. Press Preset
Start
3. Press Power
3
4. Press Avg
300
x1
IF BW
k/m .
SWEEP TIME
Return
3000
3
x1 .
5. Only For Analyzers with Option 006: Press Stop
6. Press Format
PHASE
x1 .
Marker Fctn
3
G/n .
MARKER MODE MENU
MKR STATS ON .
7. Press Scale Ref
0.6
x1 ELECTRICAL DELAY . Turn the analyzer front panel
knob to vary the electrical delay until the trace is in the most linear horizontal position.
8. Press Sweep Setup
TRIGGER MENU SINGLE . Press Marker MARKER 1
Marker Search SEARCH: MAX . Press Marker MARKER 2
Marker Search
SEARCH: MIN . Record the marker 1 or marker 2 value—whichever has the greatest
absolute value—in the “Measured Value” column of the performance test record.
From 3 GHz to 6 GHz (Option 006)
9. Press CONTINUOUS
Start
3
G/n
Stop
6
G/n .
10.Press Scale Ref
5
x1 ELECTRICAL DELAY . Turn the analyzer front panel knob
to vary the electrical delay until the trace is in the most linear horizontal position.
11.Press Sweep Setup
TRIGGER MENU
SINGLE . Press
Marker MARKER 1
MARKER 2
Marker Search
Marker Search SEARCH: MAX . Press Marker
SEARCH: MIN . Record the marker 1 or marker 2 value—whichever has the greatest
absolute value—in the “Measured Value” column of the performance test record.
2-28
Chapter 2
Performance Tests
8. Receiver Phase Frequency Response (Ratio)
B/R Phase Frequency Response
12.Connect the second type-N cable from the RF cable set to port B.
From 300 kHz to 3 GHz
13.Press CONTINUOUS
14.Press Meas
B/R
Start
Format
300
k/m .
PHASE .
15.Only For Analyzers with Option 006: Press Stop
3
G/n .
16.Press Scale Ref
0.6
x1 ELECTRICAL DELAY . Turn the analyzer front panel
knob to vary the electrical delay until the trace is in the most linear horizontal position.
17.Press Sweep Setup
TRIGGER MENU
SINGLE . Press
Marker
MARKER 1
Marker Search SEARCH: MAX . Press Marker MARKER 2
Marker Search
SEARCH: MIN . Record the marker 1 or marker 2 value—whichever has the greatest
absolute value—in the “Measured Value” column of the performance test record.
From 3 GHz to 6 GHz (Option 006)
18.Press CONTINUOUS
Start
3
G/n
Stop
6
G/n .
19.Press Scale Ref
5
x1 ELECTRICAL DELAY . Turn the analyzer front panel knob
to vary the electrical delay until the trace is in the most linear horizontal position.
20.Press Sweep Setup
MARKER 1
TRIGGER MENU
Marker Search
SINGLE . Press
SEARCH: MAX . Press
Marker
Marker
MARKER 2 Marker Search SEARCH: MIN . Record the marker 1 or marker 2
value—whichever has the greatest absolute value—in the “Measured Value” column of
the performance test record.
A/B Phase Frequency Response
21.Connect the equipment as shown in Figure 2-13.
Chapter 2
2-29
Performance Tests
8. Receiver Phase Frequency Response (Ratio)
Figure 2-13
Phase Frequency Response Test Setup
From 300 kHz to 3 GHz
22.Press CONTINUOUS
23.Press Avg
24.Press Meas
Start
IF BW
300
A/B
Format
300
k/m .
x1 .
PHASE .
25.Only For Analyzers with Option 006: Press Stop
3
G/n .
26.Press Scale Ref
0.6
x1 ELECTRICAL DELAY . Turn the analyzer front panel
knob to vary the electrical delay until the trace is in the most linear horizontal position.
27.Press Sweep Setup
TRIGGER MENU
SINGLE . Press
Marker
MARKER 1
Marker Search SEARCH: MAX . Press Marker MARKER 2
Marker Search
SEARCH: MIN . Record the marker 1 or marker 2 value—whichever has the greatest
absolute value—in the “Measured Value” column of the performance test record.
From 3 GHz to 6 GHz (Option 006)
28.Press CONTINUOUS
Start
3
G/n
Stop
6
G/n .
29.Press Scale Ref
5
x1 ELECTRICAL DELAY . Turn the analyzer front panel knob
to vary the electrical delay until the trace is in the most linear horizontal position.
30.Press Sweep Setup
TRIGGER MENU SINGLE . Press Marker MARKER 1
Marker Search SEARCH: MAX . Press Marker MARKER 2
Marker Search
SEARCH: MIN . Record the marker 1 or marker 2 value—whichever has the greatest
absolute value—in the “Measured Value” column of the performance test record.
2-30
Chapter 2
Performance Tests
8. Receiver Phase Frequency Response (Ratio)
In Case of Difficulty
1. Verify that the RF cables are in a good condition. Move the RF cables to different ports
on the power splitter and re-measure the receiver input(s) that failed.
2. Perform “Sampler Magnitude and Phase Correction Constants (Test 53)” on page 3-19.
3. Consult Chapter 8 , “Receiver Troubleshooting,” for troubleshooting information.
Chapter 2
2-31
Performance Tests
9. Receiver Input Crosstalk
9. Receiver Input Crosstalk
Perform this test to verify the signal leakage interference between input and output test
ports, with one port driven and the other one terminated.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Crosstalka
300 kHz–1 GHz
−100 dB
1 GHz–3 GHz
−90 dB
3 GHz–4.5 GHz
−82 dB
4.5–6.0 GHz
−75 dB
a. At 10 Hz IF Bandwidth
Required Equipment
Description
HP/Agilent Model Number
2-way power splitter (2), 50Ω
11667A Option 001
Termination (3), 50Ω
909F Option 012a
Attenuator, 20 dB
8491A Option 020
RF cable set, 50Ω, type-N
11851B
a. Or use terminations included in 85032B calibration kits.
Procedure
R into A Crosstalk from 300 kHz to 1 GHz
1. Connect the equipment as shown in Figure 2-14.
2-32
Chapter 2
Performance Tests
9. Receiver Input Crosstalk
Figure 2-14
R into A and R into B Crosstalk Test Setup
2. Press Preset
Power
AVERAGING ON
3. Press Scale Ref
IF BW
1
x1
AVERAGING FACTOR
Avg
5
x1
x1 .
10
x1 to get a better scaling of the data trace.
25
4. Press Marker Search
5. Press Stop
x1 .
6
SEARCH:MAX .
TRACKING ON
G/n
Sweep Setup
TRIGGER MENU
NUMBER of GROUPS
5
6. When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
R into A Crosstalk from 1 GHz to 3 GHz
7. Press Start
1
G/n
Stop
3
G/n
NUMBER of GROUPS
x1 .
5
8. When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) R into A Crosstalk from 3 GHz to 4.5 GHz
9. Press Start
3
G/n
Stop
4.5
G/n
NUMBER of GROUPS
5
x1 .
10.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) R into A Crosstalk from 4.5 GHz to 6 GHz
11.Press Start
4.5
G/n
Stop
6
G/n
NUMBER of GROUPS
5
x1 .
12.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
R into B Crosstalk from 300 kHz to 1 GHz
13.Press Start
Chapter 2
300
k/m
Stop
1
G/n .
2-33
Performance Tests
9. Receiver Input Crosstalk
14.Press Meas
x1 .
B/R
TRIGGER MENU
Sweep Setup
NUMBER of GROUPS
5
15.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
R into B Crosstalk from 1 GHz to 3 GHz
16.Press Start
5
x1 .
1
G/n
Stop
3
G/n
TRIGGER MENU
NUMBER of GROUPS
17.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) R into B Crosstalk from 3 GHz to 4.5 GHz
18.Press Start
5
x1 .
3
G/n
Stop
4.5
G/n
TRIGGER MENU
NUMBER of GROUPS
19.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) R into B Crosstalk from 4.5 GHz to 6 GHz
20.Press Start
5
x1 .
4.5
G/n
Stop
6
G/n
TRIGGER MENU
NUMBER of GROUPS
21.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
B into A Crosstalk from 300 kHz to 1 GHz
22.Connect the equipment as shown in Figure 2-15.
Figure 2-15
23.Press Start
2-34
B into A Receiver Input Crosstalk Test Setup
300
k/m
Stop
1
G/n .
Chapter 2
Performance Tests
9. Receiver Input Crosstalk
24.Press Meas
x1 .
A/B
TRIGGER MENU
Sweep Setup
NUMBER of GROUPS
5
25.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
B into A Crosstalk from 1 GHz to 3 GHz
26.Press Start
5
x1 .
1
G/n
Stop
3
G/n
TRIGGER MENU
NUMBER of GROUPS
27.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) B into A Crosstalk from 3 GHz to 4.5 GHz
28.Press Start
5
x1 .
3
G/n
Stop
4.5
G/n
TRIGGER MENU
NUMBER of GROUPS
29.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) B into A Crosstalk from
4.5 GHz to 6 GHz
30.Press Start
5
x1 .
4.5
G/n
Stop
6
G/n
TRIGGER MENU
NUMBER of GROUPS
31.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
A into B Crosstalk from 300 kHz to 1 GHz
32.Reconfigure the equipment as shown in Figure 2-16.
Figure 2-16
Chapter 2
A into B Receiver Input Crosstalk Test Setup
2-35
Performance Tests
9. Receiver Input Crosstalk
33.Press Start
300
k/m
Stop
G/n .
34.Press Meas
SINGLE .
A/R
Avg
AVERAGING OFF
1
DATA → MEMORY
35.At the end of the sweep, press Display
B/R .
36.Press Avg
AVERAGING FACTOR
TRIGGER MENU
Sweep Setup
5
x1
NUMBER of GROUPS 5
TRIGGER MENU
DATA/MEM
AVERAGING ON
Meas
Sweep Setup
x1 .
37.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
A into B Crosstalk from 1 GHz to 3 GHz
38.Press Start
1
39.Press Meas
SINGLE .
A/R
G/n
Avg
Stop
G/n .
3
AVERAGING OFF
DATA → MEMORY
40.At the end of the sweep, press Display
B/R .
41.Press Avg
AVERAGING FACTOR
TRIGGER MENU
Sweep Setup
5
x1
NUMBER of GROUPS
5
TRIGGER MENU
DATA/MEM
AVERAGING ON
Meas
Sweep Setup
x1 .
42.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) A into B Crosstalk from 3 GHz to 4.5 GHz
43.Press Start
3
44.Press Meas
SINGLE .
A/R
G/n
Avg
Stop
4.5
G/n .
AVERAGING OFF
DATA → MEMORY
45.At the end of the sweep, press Display
B/R .
46.Press Avg
AVERAGING FACTOR
TRIGGER MENU
Sweep Setup
5
x1
NUMBER of GROUPS
5
TRIGGER MENU
DATA/MEM
AVERAGING ON
Meas
Sweep Setup
x1 .
47.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
(Only for Option 006 Analyzers) A into B Crosstalk from 4.5 GHz to 6 GHz
48.Press Start
4.5
G/n
Stop
49.Press Meas
SINGLE .
A/R
Avg
AVERAGING OFF
6
50.At the end of the sweep, press Display
B/R .
2-36
G/n .
Sweep Setup
DATA → MEMORY
TRIGGER MENU
DATA/MEM
Meas
Chapter 2
Performance Tests
9. Receiver Input Crosstalk
51.Press Avg
AVERAGING FACTOR
TRIGGER MENU
5
x1
NUMBER of GROUPS 5
AVERAGING ON
Sweep Setup
x1 .
52.When the analyzer finishes the number of sweeps, write the marker value, which
appears on the analyzer display, on the performance test record.
In Case of Difficulty
1. Check for loose external RF cables. Inspect all cables for signs of damage, wear, or
faulty shielding.
2. Remove the analyzer top cover. Tighten any loose SMA connector nuts on the four
semirigid cables located between the A4/A5/A6 sampler/mixer assemblies.
3. Tighten any loose screws on the A4/A5/A6 sampler/mixer and the A7 pulse generator
assembly covers.
4. Examine the shielding clips on the A5 sampler/mixer and the A7 pulse generator
assemblies. In addition, inspect the shielding posts on the A10 digital IF board
assembly.
5. Verify that the analyzer front panel type-N connectors are tight. Check for connector
damages.
6. Refer to Chapter 8 , “Receiver Troubleshooting,” for troubleshooting information.
Chapter 2
2-37
Performance Tests
10. Receiver Trace Noise
10. Receiver Trace Noise
Perform this test to verify the receiver trace noise on a CW signal in ratio mode.
Analyzer warmup time: 30 minutes.
Specifications
Frequency Range
Ratio
Trace Noise (Magnitude)a
Trace Noise (Phase)a
IF Bandwidth = 10 Hz
300 kHz to 3 GHz
A/R
< 0.001 dB rms
< 0.006 °rms
300 kHz to 3 GHz
B/R
< 0.001 dB rms
< 0.006 °rms
3 GHz to 6 GHzb
A/R
< 0.002 dB rms
< 0.012 °rms
3 GHz to 6 GHzb
B/R
< 0.002 dB rms
< 0.012 °rms
IF Bandwidth = 3 kHz
30 kHz to 3 GHz
A/R
< 0.006 dB rms
< 0.038 °rms
30 kHz to 3 GHz
B/R
< 0.006 dB rms
< 0.038 °rms
3 GHz to 6 GHzb
A/R
< 0.010 dB rms
< 0.070 °rms
3 GHz to 6 GHzb
B/R
< 0.010 dB rms
< 0.070 °rms
a. In CW Sweep mode, at −10 dBm into receiver, channel /R ratio measurement.
b. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
2-Way power splitter, 50Ω
11667A Option 001
Attenuator, 10 dB
8491A Option 010
RF cable set, 50Ω, type-N
11851B
Procedure
1. Connect the equipment as shown in Figure 2-17.
2-38
Chapter 2
Performance Tests
10. Receiver Trace Noise
Figure 2-17
Receiver Trace Noise Test Setup
2. Press Preset
Power
3. Press CW FREQ
3
10
x1
Sweep Setup
NUMBER of POINTS
51
x1 .
G/n .
4. Press Marker Fctn MARKER MODE MENU MKR STATS ON to enable the analyzer
marker statistics feature.
A/R Trace Noise Magnitude IF BW = 10 Hz
5. Press Avg
IF BW
6. Press Meas
10
x1 .
A/R .
7. Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
8. Press Scale Ref
AUTO SCALE .
9. Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
A/R Trace Noise Phase IF BW = 10 Hz
10.Press Format
PHASE .
11.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
12.Press Scale Ref
AUTO SCALE .
13.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
Chapter 2
2-39
Performance Tests
10. Receiver Trace Noise
A/R Trace Noise Phase IF BW = 3 kHz
14.Press Avg
IF BW
3
k/m .
15.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
16.Press Scale Ref
AUTO SCALE .
17.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
A/R Trace Noise Magnitude IF BW = 3 kHz
18.Press Format
LOG MAG .
19.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
20.Press Scale Ref
AUTO SCALE .
21.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
B/R Trace Noise Magnitude IF BW = 3 kHz
22.Disconnect the RF cable from input A, and connect it to input B.
23.Press Meas
B/R .
24.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
25.Press Scale Ref
AUTO SCALE .
26.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
B/R Trace Noise Phase IF BW = 3 kHz
27.Press Format
PHASE .
28.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
29.Press Scale Ref
AUTO SCALE .
30.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
2-40
Chapter 2
Performance Tests
10. Receiver Trace Noise
B/R Trace Noise Phase IF BW = 10 Hz
31.Press Avg
IF BW
10
x1 .
32.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
33.Press Scale Ref
AUTO SCALE .
34.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
B/R Trace Noise Magnitude IF BW = 10 Hz
35.Press Format
LOG MAG .
36.Press Sweep Setup TRIGGER MENU SINGLE . Wait for the sweep to finish as
indicated by the Hld notation on the left side of the display.
37.Press Scale Ref
AUTO SCALE .
38.Write the s. dev (standard deviation) value shown, which appears on the analyzer
display, on the performance test record.
Option 006:
1. Disconnect the RF cable from input B, and connect it to input A.
2. Press Sweep Setup
CW FREQ
6
G/n .
3. Go back to “A/R Trace Noise Magnitude IF BW = 10 Hz” on page 2-39, and perform this
entire procedure again, starting with step 6. Record all values in the performance test
record for analyzers with Option 006.
In Case of Difficulty
1. Verify that the 50Ω type-N RF cables are in a good condition. If possible, try to rerun
this test with another set of RF cables.
2. Suspect the A10 digital IF board assembly.
Chapter 2
2-41
Performance Tests
11. Receiver Input Impedance
11. Receiver Input Impedance
Perform this test to verify the return loss of each of the analyzer receiver inputs.
Analyzer warmup time: 30 minutes
Specifications
Frequency Range
Receiver Input
Impedance
300 kHz–2 MHz
≥ 20 dB return loss
2 MHz–1.3 GHz
≥ 24 dB return loss
1.3 GHz–3 GHz
≥ 19 dB return loss
3 GHz–6 GHza
≥ 15 dB return loss
a. For analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
Test set, 50 Ω
85044A/85046A/85047A
2-way power splitter, 50 Ω
11667A Option 001
Attenuator, 10 dB
8491A Option 010
Termination, 50 Ω
part of cal kit 85032B
Calibration kit, 50 Ω, type-N
85032B
Adapter, APC-7 to Type-N (m)
11525A
RF cable set, 50 Ω, Type-N
11851B
RF cable, 50 Ω, 7mm
part of 11857D
Procedure
1. Connect the equipment as shown in Figure 2-18, with the following additions:
• If you are using the HP/Agilent 85044A, set the attenuation to 0 dB.
• If you are using the HP/Agilent 85046A or 85047A S-Parameter test set, connect the
test set interface cable to the analyzer and use test set port 1.
2-42
Chapter 2
Performance Tests
11. Receiver Input Impedance
Figure 2-18
Receiver B Input Impedance Test Setup
2. Press Preset
3. Press Cal
RETURN
NOTE
Start
300
k/m
Sweep Setup
SWEEP TYPE MENU
CAL KIT SELECT CAL KIT CAL KIT:N 50 Ω 85032
CALIBRATE MENU S11 1-PORT .
LOG FREQ .
RETURN
When you are performing error-correction for a system that has type-N test
port connectors, the softkey menus label the sex of the test port
connector—not the calibration standard connector.
4. Connect an open to the test port cable adapter. Press FORWARD: OPEN .
5. Connect a short to the test port cable adapter. Press SHORT .
6. Connect a 50 Ω termination to the adapted test port cable. Press LOAD
DONE 1-PORT CAL .
7. Remove the 50 Ω termination from the test port cable adapter. Connect the adapted test
port cable to the analyzer INPUT B. Press Scale Ref AUTO SCALE .
8. Press Sweep Setup
TRIGGER MENU
SINGLE .
9. Press Marker MARKER 1 300 k/m MARKER 2
marker 2 to 300 kHz and 2 MHz respectively.
2
M/µ
to set marker 1 and
10.Use the analyzer front panel knob to move marker 2 to the peak value between 300 kHz
and 2 MHz. Write the marker 2 reading on the performance test record under
“B Return Loss (A/R),” 300 kHz–2 MHz.
MARKER 2
11.Press Marker MARKER 1 2
M/µ
marker 2 to 2 MHz and 1.3 GHz respectively.
1.3
G/n
to set marker 1 and
12.Use the analyzer front panel knob to move marker 2 to the peak value between 2 MHz
and 1.3 GHz. Write the marker 2 reading on the performance test record under “B
Return Loss (A/R),” 2 MHz–1.3 GHz.
Chapter 2
2-43
Performance Tests
11. Receiver Input Impedance
13.Press MARKER 1 1.3
G/n MARKER 2
to 1.3 GHz and 3 GHz respectively.
3
G/n
to set marker 1 and marker 2
14.Use the analyzer front panel knob to move marker 2 to the peak value between 1.3 GHz
and 3 GHz. Write the marker 2 reading on the performance test record under “B Return
Loss (A/R),” 1.3–3 GHz.
15.For Option 006:
a. Press MARKER 1 3
G/n MARKER 2
to 3 GHz and 6 GHz respectively.
6
G/n
to set marker 1 and marker 2
b. Use the analyzer front panel knob to move marker 2 to the peak value between
3 GHz and 6 GHz. Write the marker 2 reading on the performance test record under
“B Return Loss A/R,” 3 GHz–6 GHz.
16.Connect the equipment as shown in Figure 2-19.
Figure 2-19
Receiver A Input Impedance Test Setup
17.Press Meas
B/R .
18.Press Sweep Setup
19.Press Cal
TRIGGER MENU
CALIBRATE MENU
CONTINUOUS .
S11 1-PORT .
20.Connect an open to the test port cable adapter. Press FORWARD: OPEN .
21.Connect a short to the test port cable adapter. Press SHORT .
22.Connect a 50 Ω termination to the adapted test port cable. Press LOAD
DONE 1-PORT CAL .
23.Remove the 50 Ω termination from the test port cable adapter. Connect the adapted test
port cable to the analyzer INPUT A. Press Scale Ref AUTO SCALE .
24.Press Sweep Setup
2-44
TRIGGER MENU
SINGLE .
Chapter 2
Performance Tests
11. Receiver Input Impedance
25.Press Marker MARKER 1 300 k/m MARKER 2
marker 2 to 300 kHz and 2 MHz respectively.
2
M/µ
to set marker 1 and
26.Use the analyzer front panel knob to move marker 2 to the peak value between 300 kHz
and 2 MHz. Write the marker 2 reading on the performance test record under “A Return
Loss (B/R),” 300 kHz–2 MHz.
27.Press Marker MARKER 1 2 M/µ MARKER 2
marker 2 to 2 MHz and 1.3 GHz respectively.
1.3
G/n
to set marker 1 and
28.Use the analyzer front panel knob to move marker 2 to the peak value between 2 MHz
and 1.3 GHz. Write the marker 2 reading on the performance test record under “A
Return Loss (B/R),” 2 MHz–1.3 GHz.
29.Press MARKER 1 1.3
G/n MARKER 2
to 1.3 GHz and 3 GHz respectively.
3
G/n
to set marker 1 and marker 2
30.Use the analyzer front panel knob to move marker 2 to the peak value between 1.3 GHz
and 3 GHz. Write the marker 2 reading on the performance test record under “A Return
Loss (B/R),” 1.3–3 GHz.
31.For Option 006:
a. Press MARKER 1 3
G/n MARKER 2
to 3 GHz and 6 GHz respectively.
6
G/n
to set marker 1 and marker 2
b. Use the analyzer front panel knob to move marker 2 to the peak value between
3 GHz and 6 GHz. Write the marker 2 reading on the performance test record under
“A Return Loss B/R,” 3 GHz–6 GHz.
32.Connect the equipment as shown in Figure 2-20.
Figure 2-20
Receiver R Input Impedance Test Calibration Test Setup
33.Press Meas
A/B .
34.Press Sweep Setup
Chapter 2
TRIGGER MENU
CONTINUOUS .
2-45
Performance Tests
11. Receiver Input Impedance
35.Press Cal
CALIBRATE MENU
S11 1-PORT .
36.Connect an open to the test port cable adapter. Press FORWARD: OPEN .
37.Connect a short to the test port cable adapter. Press SHORT .
38.Connect a 50 Ω termination to the adapted test port cable. Press LOAD
DONE 1-PORT CAL .
39.Connect the equipment as shown in Figure 2-21.
Figure 2-21
Receiver R Input Impedance Test Setup
40.Remove the 50 Ω termination from the test port cable adapter. Connect the adapted test
port cable to the analyzer INPUT R. Press Scale Ref AUTO SCALE .
41.Press Sweep Setup
TRIGGER MENU
SINGLE .
42.Press Marker MARKER 1 300 k/m MARKER 2
marker 2 to 300 kHz and 2 MHz respectively.
2
M/µ
to set marker 1 and
43.Use the analyzer front panel knob to move marker 2 to the peak value between 300 kHz
and 2 MHz. Write the marker 2 reading on the performance test record under
“R Return Loss (A/B),” 300 kHz–2 MHz.
44.Press Marker MARKER 1 2 M/µ MARKER 2
marker 2 to 2 MHz and 1.3 GHz respectively.
1.3
G/n
to set marker 1 and
45.Use the analyzer front panel knob to move marker 2 to the peak value between 2 MHz
and 1.3 GHz. Write the marker 2 reading on the performance test record under
“R Return Loss (B/R),” 2 MHz–1.3 GHz.
46.Press MARKER 1 1.3
G/n MARKER 2
to 1.3 GHz and 3 GHz respectively.
2-46
3
G/n
to set marker 1 and marker 2
Chapter 2
Performance Tests
11. Receiver Input Impedance
47.Use the analyzer front panel knob to move marker 2 to the peak value between 1.3 GHz
and 3 GHz. Write the marker 2 reading on the performance test record under “R Return
Loss (A/B),” 1.3–3 GHz.
48.For Option 006:
a. Press MARKER 1 3 G/n MARKER 2
to 3 GHz and 6 GHz respectively.
6
G/n
to set marker 1 and marker 2
b. Use the analyzer front panel knob to move marker 2 to the peak value between
3 GHz and 6 GHz. Write the marker 2 reading on the performance test record under
“R Return Loss A/B,” 3 GHz–6 GHz.
In Case of Difficulty
1. Check your test setup for damage or excessive wear of the input connectors.
2. Impedance mismatch may also be caused by the samplers, or the semirigid cables
connecting the A4/A5/A6 sampler mixer assemblies to the analyzer front panel type-N
connectors. Check for damaged semirigid cables. If no damage is apparent at the input
connectors, try interchanging the sampler assemblies. If the problem goes away, the
sampler which you just swapped is defective. If the problem still exists, suspect the path
from the type-N connector input to the sampler assembly.
3. Consult Chapter 8 , “Receiver Troubleshooting,” for troubleshooting information.
Chapter 2
2-47
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
12. Receiver Magnitude Dynamic Accuracy
The analyzer’s receiver linearity versus input power is measured with a calibrated step
attenuator. Measurement uncertainty is minimized by using the analyzer’s capability to
perform error correction.
Analyzer warmup time: 30 minutes
Specifications
2-48
Chapter 2
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
Required Equipment
Description
HP/Agilent Part or Model Number
Power Meter
436A/437B/438A or E4418B/E4419B
Power Sensor
8482A
Step Attenuator, 110 dB
8496A Option H19 (See note below.)
Cable (2), APC-7, 50 Ω, 24-inch
8120-4779
Cable, GPIB
10833A
Calibration Kit, 7-mm
85031B
S-Parameter Test Set
85047A/85406A
Additional Equipment for the
85046B Test Set (75 Ω)
Minimum Loss Pad (2), 50 Ω to 75 Ω
11852B
Adapter (2), APC-7 to Type-N (m)
11525A
NOTE
The HP/Agilent 8496A step attenuator (Option H19) comes with a special
calibration that supports the measurement uncertainties expressed in the
test record for this performance test.
The special calibration consists of two measurements. The first is a
measurement of the attenuation at each step. The data reported for this
measurement have the following uncertainties:
• ±0.006 dB from 0 to 40 dB
• ±0.015 dB from >40 to 80 dB
• ±0.025 dB from >80 to 90 dB
• ±0.05 dB >90 dB
The second calibration measurement characterizes match stability between
attenuator settings for each attenuator port. The vector difference of S11 or
(S22) between the reference attenuation step and all the other steps is
measured. The magnitude of this difference is certified to be <0.0316
(>30 dB).
Chapter 2
2-49
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
Procedure
Initial Calculations
1. Fill in the attenuator error values (referenced to 0 dB attenuation) in Table 2-1 by
referring to the calibration data for the 8496A step-attenuator. Refer to the note below if
the calibration data are not expressed as attenuation errors.
a. Find the column in the 8496A attenuation error table that pertains to the
attenuation errors for 30 MHz.
b. Starting with the 10 dB step in this column, write down the value in the
corresponding space in Table 2-1 for column B. This value should be placed in the
row for the 10 dB 8496A setting.
c. Continue transferring the remaining values of the 8496A attenuation errors to
column B in Table 2-1.
2. In Table 2-1, transfer the 20 dB error value located within the parenthesis in column B
to each space in column C.
NOTE
The 8496A used for this test will have known attenuator errors for
attenuations up to 100 dB using a test frequency of 30 MHz. The attenuation
used as a reference is 0 dB. If the available calibration data are not expressed
as attenuation errors, they can be converted to such a form by the following
equation:
(actual attenuation) − (expected attenuation) = attenuator error
Actual attenuation values that are greater than the expected attenuation
values will result in positive errors. Actual attenuation values that are less
than the expected attenuation values will result in negative errors.
2-50
Chapter 2
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
Table 2-1
Magnitude Dynamic Accuracy Calculations
A
B
C
D
(B − C)
E
F
(E − D)
8496A Attn.
(dB)
Attn. Error
(ref 0 dB)
20 dB Error
Value
Attn. Error
(ref 20 dB)
Expected
Measurement
(dB)
Expected
Measurement
(corrected)
(dB)
0
0 dB
20
10
20
10
(
)
0 dB
0
30
− 10
40
− 20
50
− 30
60
− 40
70
− 50
80
− 60
90
− 70
100
− 80
0.00
3. The values in column D result from changing the reference attenuation of the
calibration data of the 8496A to 20 dB.
Calculate the attenuation error values for this column by subtracting the values in
column C from the values in column B. The result is B − C = D.
4. The values in column F result from correcting the expected measurement value by the
amount of attenuator error.
Calculate the values in this column by subtracting the values in column D from the
values in column E. The result is E − D = F.
5. Transfer the values from column F in Table 2-1 to column F in the performance test
record for both receiver channels.
Power Meter Calibration
6. Zero and calibrate the power meter. (Refer to the power meter manual for details on this
procedure.)
7. Connect the equipment as shown in Figure 2-22. Be sure to remove the cable from the B
channel connectors.
Chapter 2
2-51
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
Figure 2-22
Power Meter Calibration
8. Set the 8496A to 20 dB.
9. Set the following analyzer parameters:
•
Preset
•
NUMBER of POINTS
•
Power
•
Avg
Sweep Setup
10
IF BW
CW FREQ
51
30
M/µ
x1
x1
10
x1
10.Set up the analyzer for power meter calibration:
a. Select the analyzer as the system controller:
•
Local
•
SYSTEM CONTROLLER
b. Set the power meter's address:
•
SET ADDRESSES
•
ADDRESS: P MTR/GPIB
13
x1
c. Select the appropriate power meter by pressing POWER MTR until the correct
model number is displayed. (Use the 438A/437 selection if the power meter is an
HP/Agilent E4419B or E4418B.)
d. Select the calibration kit and enter the power sensor calibration data.
•
•
2-52
Cal
CAL KIT
SELECT CAL KIT
7mm 85031
CAL FACTOR SENSOR A (enter
the power sensor calibration data for 30 MHz) DONE
Cal
PWRMTR CAL
LOSS/SENSOR LISTS
Chapter 2
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
11.Take a power meter calibration sweep.
•
Cal
•
ONE SWEEP
PWRMTR CAL
−30
x1
TAKE CAL SWEEP
12.Verify that the power meter reads approximately −30 dBm.
Full 2-Port Calibration
13.Connect the equipment as shown in the Figure 2-23. Be sure to reconnect the cable to
the B channel connectors.
Figure 2-23
Full 2-Port Calibration
14.Perform a full 2-port error correction with isolation.
15.Save the results of the new cal set.
Measure Channel B Magnitude Dynamic Accuracy
16.Connect the equipment as shown in Figure 2-24. Confirm that the step attenuator is set
to 20 dB.
Chapter 2
2-53
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
Figure 2-24
Magnitude Dynamic Accuracy, Channel B
17.To set up the dynamic accuracy measurement, press the following:
•
Meas
•
Marker Fctn
•
Sweep Setup
Trans: FWD S21 (B/R)
MKR MODE MENU
TRIGGER MENU
MKR STATS ON
SINGLE
18.Wait for the sweep to finish, then press Display
DATA → MEMORY
DATA/MEM .
19.Set the step attenuator to 0 dB.
20.Press Sweep Setup
TRIGGER MENU
SINGLE .
21.Press Format MORE REAL . Write the mean value (which appears on the
analyzer’s display) in the column marked “Real Part” in the performance test record.
Note that the analyzer will display units as mU, µU, or nU, which are abbreviations for
10−3 units, 10−6 units, and 10−9 units, respectively.
22.Press IMAGINARY . Write the mean value (which appears on the analyzer’s display) in
the column marked “Imaginary Part” in the performance test record. Note that the
analyzer will display units as mU, µU, or nU, which are abbreviations for 10−3 units,
10−6 units, and 10−9 units, respectively.
23.Repeat steps 19 through 22 for each setting of the step attenuator as written in the
performance test record.
24.For each pair of real and imaginary parts calculate the value given by the formula:
10 log10 [(Real Part)2 + (Imaginary Part)2]. Write the result in the performance test
record in the “Test Port Measurement” column (column “G”).
2-54
Chapter 2
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
25.Calculate the dynamic accuracy for each attenuator setting by using the formula:
|G − F| (the absolute value of the difference between the values in column “G” and
column “F”).
Channel A Magnitude Dynamic Accuracy
To measure the magnitude dynamic accuracy of channel A, the test set is switched to route
transmitted power to the A sampler of the analyzer (an S12 measurement at port 1 and
port 2 of the test set). Before channel A’s magnitude dynamic accuracy can be measured, a
power meter calibration and full two-port calibration must be performed for this new
signal path.
Power Meter Calibration for Channel A
1. Connect the equipment as shown in Figure 2-25. Be sure to remove the cable from the
channel A connectors.
Figure 2-25
Power Meter Calibration, Channel A
2. Set the 8496A to 20 dB.
3. Set the following analyzer parameters:
•
Sweep Setup
•
Meas
Chapter 2
TRIGGER MENU
CONTINUOUS
Trans: REV S12 (A/R)
2-55
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
4. Take a power meter calibration sweep.
•
Cal
•
ONE SWEEP
PWRMTR CAL
−30
x1
TAKE CAL SWEEP
5. Verify that the power meter reads approximately −30 dBm.
Full 2-Port Calibration
6. Connect the equipment as shown in the Figure 2-26 Be sure to reconnect the cable to
the A channel connectors.
Figure 2-26
Full 2-Port Calibration
7. Perform a full 2-port error correction with isolation.
8. Save the results of the new cal set.
Measure Channel A Magnitude Dynamic Accuracy
9. Set the step attenuator to 20 dB.
10.To set up the dynamic accuracy measurement, press the following:
•
Display
•
Sweep Setup
DATA
TRIGGER MENU
SINGLE
11.Wait for the sweep to finish, then press Display
DATA → MEMORY DATA/MEM .
12.Set the step attenuator to 0 dB.
13.Press Sweep Setup
TRIGGER MENU
SINGLE .
14.Press Format MORE REAL . Write the mean value (which appears on the
analyzer’s display) in the column marked “Real Part” in the performance test record.
2-56
Chapter 2
Performance Tests
12. Receiver Magnitude Dynamic Accuracy
Note that the analyzer will display units as mU µU or nU, which are abbreviations for
10−3 units, 10−6 units, and 10−9 units, respectively.
15.Press IMAGINARY . Write the mean value (which appears on the analyzer’s display) in
the column marked “Imaginary Part” in the performance test record. Note that the
analyzer will display units as mU µU or nU, which are abbreviations for 10−3 units, 10−6
units, and 10−9 units, respectively.
16.Repeat steps 12 through 15 for each setting of the step attenuator as written in the
performance test record.
17.For each pair of real and imaginary parts calculate the value given by the formula:
10 log10 [(Real Part)2 + (Imaginary Part)2]. Write the result in the performance test
record in the “Test Port Measurement” column (column “G”).
18.Calculate the dynamic accuracy for each attenuator setting by using the formula:
|G − F| (the absolute value of the difference between the values in column “G” and
column “F”).
In Case of Difficulty
1. If the analyzer fails the test at all power levels, be sure you followed the recommended
attenuator settings as listed in the performance test record. Repeat this performance
test.
2. If both test port measured values are out of specifications:
a. Recalibrate the power meter.
b. Repeat this performance test.
3. If the analyzer fails either channel B or channel A dynamic accuracy at lower power
levels:
a. Perform “IF Amplifier Correction Constants (Test 51)” on page 3-16 and “ADC Offset
Correction Constants (Test 52)” on page 3-18.
b. Repeat this performance test.
c. If it still fails, replace the A10 Digital IF assembly.
d. Repeat the two adjustment procedures mentioned step a, and then repeat this
performance test.
Chapter 2
2-57
Performance Tests
13. Receiver Magnitude Compression
13. Receiver Magnitude Compression
Perform this test to verify the compression/expansion magnitude levels of the analyzer's
receiver samplers. Power sweeps from low to high power are made at designated CW
frequencies. A reference measurement is made while the signal to the receiver is
attenuated to avoid compression. The attenuation is removed and compression is observed
and measured.
Analyzer warmup time: 30 minutes
Specifications
Frequency Range
Receiver Channel
Magnitudea
300 kHz–3 GHz
A
≤ 0.55 dB
3 GHz–6 GHzb
A
≤ 0.87 dB
300 kHz–3 GHz
B
≤ 0.55 dB
3 GHz–6 GHzb
B
≤ 0.87 dB
a. With 10 Hz IF bandwidth.
b. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
Power meter
437B/438A or E4418B/E4419B
Power sensor
8482A
Attenuator, 3 dB
8491A Option 003
Attenuator, 10 dB
8491A Option 010
Attenuator, 20 dB
8491A Option 020
Cable (2), 50Ω type-N, 24-inch
8120-4781
2-way power splitter (2), 50Ω
11667A Option 001
Additional Equipment for Option 006 Analyzers
Power sensor
8481A
Channel A Magnitude Compression
1. Zero and calibrate the power meter.
2. Connect the equipment as shown in Figure 2-27.
2-58
Chapter 2
Performance Tests
13. Receiver Magnitude Compression
Figure 2-27
Channel A Magnitude Compression Test Setup
3. On the analyzer, press Preset
Avg
IF BW
10
x1 .
4. Press Sweep Setup CW FREQ 300 k/m SWEEP TYPE MENU CW TIME . Set
the calibration factor on the power meter for this CW frequency.
5. Press Power
−4
x1 . Use the analyzer's front panel knob to adjust the source
power for a power meter reading of −20.00 dBm. Write the source power value, which
appears on the analyzer's display, in the “Start Power” column of the performance test
record.
6. Press 15
x1 . Use the analyzer's front panel knob to adjust the source power for a
power meter reading of 0.00 dBm. Write the source power value in the “Stop Power”
column of the performance test record.
7. Press Sweep Setup SWEEP TYPE MENU POWER SWEEP Start . Use the
analyzer's number keypad to enter the “Start Power” value as determined in step 5.
8. Press Stop and enter the “Stop Power” value as determined in step 6.
9. Press Sweep Setup
TRIGGER MENU
10.At the end of the sweep, press Scale Ref
SINGLE .
AUTO SCALE .
11.Press Marker MARKER 1 and then enter the “Start Power” as determined and
recorded in step 5.
Chapter 2
2-59
Performance Tests
13. Receiver Magnitude Compression
12.Press ∆ MODE MENU
∆REF=1 . (This step is only necessary for the first frequency.)
13.Press Marker
MARKER 2
Marker Search
SEARCH: MAX .
14.Press Marker
MARKER 3
Marker Search
SEARCH: MIN .
15. Determine which value of marker 2 and marker 3 has the largest absolute value.
Record this value in the column of the performance test record labeled “Measured
Value.”
16.Press Sweep Setup CW FREQ 50 M/µ (or the next CW frequency from the test
record). Set the calibration factor on the power meter for this CW frequency.
17.Press TRIGGER MENU CONTINUOUS
CW TIME .
Sweep Setup
SWEEP TYPE MENU
18.Press Power . Use the analyzer's front panel knob to adjust the source power for a
power meter reading of −20.00 dBm. Write the source power value, which appears on
the analyzer's display, in the “Start Power” column of the performance test record.
19.Press 15
x1 . Use the analyzer's front panel knob to adjust the source power for a
power meter reading of 0.00 dBm. Write the source power value in the “Stop Power”
column of the performance test record.
20.Press Sweep Setup SWEEP TYPE MENU POWER SWEEP Start . Use the
analyzer's keypad to enter the “Start Power” value as determined in step 18.
21.Press Stop and enter the “Stop Power” value as determined in step 19.
22.Press Sweep Setup
Scale Ref
TRIGGER MENU
SINGLE . At the end of the sweep, press
AUTO SCALE .
23.Repeat steps 11 to 22 (omitting step 12) for the other CW frequencies listed in the
performance test record.
2-60
Chapter 2
Performance Tests
13. Receiver Magnitude Compression
Channel B Magnitude Compression
24.Connect the equipment as shown in Figure 2-28.
Figure 2-28
Channel B Magnitude Compression Test Setup
25.Press Meas
B/R
Sweep Setup
TRIGGER MENU
CONTINUOUS .
26.Repeat the procedure starting with step 4 for the CW frequencies listed in the
performance test record.
In Case of Difficulty
1. If the analyzer fails the channel A compression test, suspect the A5 A sampler
assembly. Repeat this test. Replace the sampler assembly if the problem still exists.
2. Suspect the A6 B sampler assembly if the analyzer fails the channel B compression test.
Repeat this test. Exchange the sampler assembly if the failure still occurs.
Chapter 2
2-61
Performance Tests
14. Receiver Phase Compression
14. Receiver Phase Compression
Perform this test to verify the compression/expansion magnitude levels of the analyzer's
receiver samplers.
Analyzer warmup time: 30 minutes
Specifications
Frequency Range
Receiver
Channel
Compressiona
300 kHz–3 GHz
A
≤ 8.0 °
3 GHz–6 GHzb
A
≤ 8.1 °
300 kHz–3 GHz
B
≤ 8.0 °
3 GHz–6 GHzb
B
≤ 8.1 °
a. With 10 Hz IF bandwidth.
b. Only for analyzers with Option 006.
Required Equipment
Description
HP/Agilent Part or Model Number
Power Meter
437B/438A
Power Sensor
8482A
Attenuator, 3 dB
8491A Option 003
Attenuator, 10 dB
8491A Option 010
Attenuator, 20 dB
8491A Option 020
Cable (2), 50 Ω type-N, 24-inch
8120-4781
2-Way power splitter (2), 50 Ω
11667A Option 001
Additional Equipment for Option 006 Analyzers
Power Sensor
8481A
Channel A Phase Compression
1. Zero and calibrate the power meter.
2. Connect the equipment as shown in Figure 2-29.
2-62
Chapter 2
Performance Tests
14. Receiver Phase Compression
Figure 2-29
Channel A Phase Compression Test Setup
3. Press Preset
Avg
IF BW
10
x1
Format
PHASE .
4. Press Sweep Setup CW FREQ 300 k/m SWEEP TYPE MENU CW TIME . Set
the calibration factor on the power meter for this CW frequency.
5. Press Power
−4
x1 . Use the analyzer's front panel knob to adjust the source
power for a power meter reading of −20.00 dBm. Write the source power value, which
appears on the analyzer's display, in the “Start Power” column of the performance test
record.
6. Press 15
x1 . Use the analyzer's front panel knob to adjust the source power for a
power meter reading of 0.00 dBm. Write the source power value in the “Stop Power”
column of the performance test record.
7. Press Sweep Setup SWEEP TYPE MENU POWER SWEEP Start . Use the
analyzer's keypad to enter the “Start Power” value as determined in step 5.
8. Press Stop and enter the “Stop Power” value as determined in step 6.
9. Press Sweep Setup
TRIGGER MENU
10.At the end of the sweep, press Scale Ref
SINGLE .
AUTO SCALE .
11.Press Marker MARKER 1 and then enter the “Start Power” as determined and
recorded in step 5.
Chapter 2
2-63
Performance Tests
14. Receiver Phase Compression
12.Press ∆ MODE MENU
∆REF=1 . (This step is only necessary for the first frequency.)
13.Press Marker
MARKER 2
Marker Search
SEARCH: MAX .
14.Press Marker
MARKER 3
Marker Search
SEARCH: MIN .
15. Determine which value of marker 2 and marker 3 has the largest absolute value.
Record this value in the column of the test record labeled “Measured Value.”
16.Press Sweep Setup CW FREQ 50 M/µ . Set the calibration factor on the power
meter for this CW frequency (or the next CW frequency from the performance test
record).
17.Press TRIGGER MENU CONTINUOUS
CW TIME .
Sweep Setup
SWEEP TYPE MENU
18.Press Power . Use the analyzer's front panel knob to adjust the source power for a
power meter reading of −20.00 dBm. Write the source power value, which appears on
the analyzer's display, in the “Start Power” column of the performance test record.
19.Press 15
x1 . Use the analyzer's front panel knob to adjust the source power for a
power meter reading of 0.00 dBm. Write the source power value in the “Stop Power”
column of the performance test record.
20.Press Sweep Setup SWEEP TYPE MENU POWER SWEEP Start . Use the
analyzer's keypad to enter the “Start Power” value as determined in step 18.
21.Press Stop and enter the “Stop Power” value as determined in step 19.
22.Press Sweep Setup
Scale Ref
TRIGGER MENU
SINGLE . At the end of the sweep, press
AUTO SCALE .
23.Repeat steps 11 to 22 (omitting step 12) for the other CW frequencies listed in the
performance test record.
2-64
Chapter 2
Performance Tests
14. Receiver Phase Compression
Channel B Phase Compression
24.Connect the equipment as shown in Figure 2-30.
Figure 2-30
Channel B Phase Compression Test Setup
25.Press Meas
B/R
CONTINUOUS .
Format
PHASE
Sweep Setup
TRIGGER MENU
26.Repeat step 23 for the CW frequencies listed in the performance test record.
In Case of Difficulty
1. If the analyzer fails the channel A compression test, suspect the A5 A sampler
assembly. Repeat this test. Replace the sampler assembly if the problem still exists.
2. Suspect the A6 B sampler assembly if the analyzer fails the channel B compression test.
Repeat this test. Exchange the sampler assembly if the failure still occurs.
Chapter 2
2-65
Performance Tests
15. Source and Receiver Harmonics (Option 002 Only)
15. Source and Receiver Harmonics (Option 002 Only)
Perform this test to determine the 2nd and 3rd harmonics of the source and receiver.
Analyzer warmup time: 30 minutes
Specifications
Source Harmonicsa
Power Level
2nd Harmonic 16 MHz–3 GHz
< −25 dBc
3rd Harmonic 16 MHz–2 GHz
<−25 dBc
Receiver Harmonicsb
2nd Harmonic
< −15 dBc
3rd Harmonic
<−30 dBc
Source and Receiver Harmonics
2nd Harmonic
<−15 dBc
3rd Harmonic
<−30 dBc
a. At +20 dBm output level (or +18 dBm for Option 006).
b. At 0 dBm input level.
Required Equipment
Description
HP/Agilent Model Number
2-way power splitter, 50Ω
11667A Option 001
Attenuator, 10 dB
8491A Option 010
Attenuator, 30 dB
8491A Option 030
RF cable set, 50Ω type-N
11851B
2-66
Chapter 2
Performance Tests
15. Source and Receiver Harmonics (Option 002 Only)
Procedure
Source Harmonics
1. Connect the equipment as shown in Figure 2-31.
Figure 2-31
Source Harmonics Test Setup
2. Press Preset Power 20
x1 (or 18
x1 if the analyzer has Option 006) to set
the test port power to +20 dBm (or +18 dBm).
3. Press Start 16
M/µ . To set the frequency range:
If you do not have Option 006, press Stop 1.5
G/n .
If you have Option 006, press Stop 3
G/n .
4. Press Avg
IF BW
5. Press Meas
10
x1 to set the IF bandwidth to 10 Hz.
A.
6. After one sweep, press Display
trace.
7. Press System
DATA → MEMORY
HARMONIC MEAS
8. After one sweep, press Scale Ref
9. Press Marker Search
DATA/MEM to normalize the
HARMONIC SECOND .
AUTO SCALE to get a better viewing of the trace.
SEARCH:MAX .
10.Write the marker 1 value (which appears on the analyzer display) on the performance
test record. This is the worst-case source 2nd harmonic.
11.To change the stop frequency:
If you do not have Option 006, press Stop
Chapter 2
1
G/n .
2-67
Performance Tests
15. Source and Receiver Harmonics (Option 002 Only)
If you have Option 006, press Stop
12.Press System
HARMONIC MEAS
13.After one sweep, press Display
trace.
14.Press Scale Ref
15.Press System
2
G/n .
HARMONIC OFF .
DATA → MEMORY
DATA/MEM to normalize the
AUTO SCALE to get a better viewing of the trace.
HARMONIC MEAS
16.After one sweep, press Scale Ref
17.Press Marker Search
HARMONIC THIRD .
AUTO SCALE .
SEARCH:MAX .
18.Write the marker 1 value on the performance test record.
Receiver Harmonics
19.Connect the equipment as shown in Figure 2-32.
Figure 2-32
Receiver Harmonics Test Setup
20.Press Power 6 x1 System HARMONIC MEAS HARMONIC OFF . To set the
frequency range:
If you do not have Option 006, press Stop 1.5
G/n .
If you have Option 006, press Stop 3
G/n .
21.Repeat steps 5 through 10 to measure the receiver worst case 2nd harmonic for the
receiver input B. Press Meas B in step 5.
2-68
Chapter 2
Performance Tests
15. Source and Receiver Harmonics (Option 002 Only)
22.Repeat steps 11 through 18 to measure the receiver worst case 3rd harmonic for the
receiver input B.
23.Press System
HARMONIC MEAS
HARMONIC OFF .
24.Repeat steps 5 through 10 to measure the receiver worst case 2nd harmonic for the
receiver input A. Press Meas A in step 5.
25.Repeat steps 11 through 18 to measure the receiver worst case 3rd harmonic for the
receiver input A.
In Case of Difficulty
1. If source harmonics fail, replace the A3 source assembly.
2. If the A receiver harmonics fail, replace the A5 sampler/mixer assembly.
3. Replace the A6 sampler/mixer assembly if the B receiver harmonics fail.
Chapter 2
2-69
Performance Tests
16. Harmonic Measurement Accuracy (Option 002 Only)
16. Harmonic Measurement Accuracy
(Option 002 Only)
This test verifies the network analyzer’s accuracy when operating in the harmonic
measurement mode (Option 002). The analyzer’s reading is compared to that of the power
meter. The allowable difference is shown in the “Specifications” table.
Analyzer warmup time: 30 minutes
Specifications
Frequency Range
Harmonic Measurement
Accuracya
16 MHz–3 GHz
± 1.5 dB
3 GHz– 6 GHzb
± 3 dB
a. At 25 °C ± 5 °C, A, B, R, −10 dBm input.
b. Only for analyzers with Options 002 and 006.
Required Equipment
Description
HP/Agilent Part or Model Number
External source
83620A or 83712A
Power meter
436A/437B/438A or E4418B/E4419B
Power sensor
8482A
2-way power splitter, 50Ω
11667A Option 001
Attenuator, 10 dB
8491A Option 010
RF cable set, 50Ω type-N
11851B
Cable, BNC 24-inch
8120-1840
Adapter, 3.5-mm (f) to type-N (f)
1250-1745
Additional Equipment for Option 006 Analyzers
Power sensor
2-70
8481A
Chapter 2
Performance Tests
16. Harmonic Measurement Accuracy (Option 002 Only)
Procedure
A Channel Harmonic Measurement Accuracy
1. Connect the equipment as shown in Figure 2-33.
Figure 2-33
Harmonic Measurement Accuracy Test Setup
2. Zero and calibrate the power meter. Set the power meter to measure dBm. Refer to the
power meter operating manual for more information on how to perform these tasks.
3. Preset the external source, and set the power level to −3.5 dBm and the CW frequency
to 32 MHz. Set the power meter for the appropriate calibration factor.
4. Write the power meter reading on the performance test record. It should read
approximately −10 dBm.
5. On the network analyzer, press Preset
the analyzer internal source to 16 MHz.
6. Press System
HARMONIC MEAS
Sweep Setup
CW FREQ
16
M/µ
to set
SECOND .
7. Press Marker
Meas A . Write the marker 1 reading, which appears on the analyzer
display, in the “Input A Value” column on the performance test record.
8. On the external source, set the CW frequency to 48 MHz. Reset the power meter for the
appropriate calibration factor.
9. Record the power meter reading on the performance test record.
Chapter 2
2-71
Performance Tests
16. Harmonic Measurement Accuracy (Option 002 Only)
10.On the network analyzer, press System HARMONIC MEAS THIRD . Write the
marker 1 reading in the “Input A Value” column on the performance test record.
11.On the network analyzer, press System HARMONIC MEAS OFF Sweep Setup
CW FREQ 31
M/µ to set the analyzer to the next fundamental frequency.
12.On the external source, set the CW frequency to 62 MHz. Reset the power meter for the
appropriate calibration factor.
13.Record the power meter reading on the performance test record.
14.On the network analyzer, press System HARMONIC MEAS SECOND . Write the
marker 1 reading in the “Input A Value” column on the performance test record.
15.On the external source, set the CW frequency to 93 MHz. Reset the power meter for the
appropriate calibration factor.
16.Record the power meter reading on the performance test record.
17.On the network analyzer, press System HARMONIC MEAS THIRD . Write the
marker 1 reading in the “Input A Value” column on the performance test record.
18.Repeat steps 11 through 17 for the CW frequencies listed on the performance test
record.
NOTE
For Option 006 analyzers, use the 8481A sensor when the external source is
set to 6 GHz. Zero and calibrate the power meter for this sensor.
19.For each measurement, calculate the difference between the measurement and the
power meter level.
20.Write the calculation results in the performance test record.
21.Compare the results with the specification.
B Channel Harmonic Measurement Accuracy
1. Move the RF cable from port A to port B on the analyzer.
2. Repeat steps 2 through 21 of the previous procedure with the following modifications:
• Do not rewrite the power meter readings on the performance test record.
• Write the marker 1 values in the “Input B Value” column of the performance test
record.
2-72
Chapter 2
Performance Tests
Performance Test Records
Performance Test Records
The performance test records in this chapter include entries up to 6 GHz for analyzers that
have Option 006 (6 GHz operation). If your analyzer does not have Option 006, write “N/A”
for entries above 3 GHz.
Calibration Lab Address:
Report Number
Date
Last Calibration Date
Customer’s Name
Performed by
Model 8753ES
Serial No.
Options
011
°C
Relative Humidity
%
Model
Number
Trace Number
Cal Due Date
Firmware Revision
Ambient Temperature
Test Equipment Used
Description
Frequency Counter
Power Meter
Power Sensor
Calibration Kit
Notes/Comments
Chapter 2
2-73
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
1. Source Frequency Range and Accuracy
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW Frequency
(MHz)
Min.
(MHz)
Results Measured
(MHz)
Max.
(MHz)
Measurement
Uncertainty
(MHz)
0.03a
0.029 999 7
0.030 000 3
±0.000 000 050
0.3
0.299 997
0.300 003
±0.000 000 520
5.0
4.999 950
5.000 050
±0.000 009
16.0
15.999 840
16.000 160
±0.000 028
31.0
30.999 690
31.000 310
±0.000 054
60.999 999
60.999 389
61.000 609
±0.000 105
121.0
120.998 790
121.001 210
±0.000 207
180.0
179.998 200
180.001 800
±0.000 307
310.0
309.996 900
310.003 100
±0.000 528
700.0
699.993 000
700.007 000
±0.001 192
1 300.0
1 299.987
1 300.013
±0.002 212
2 000.0
1 999.980
2 000.020
±0.003 403
3 000.0
2 999.970
3 000.030
±0.005 104
4 000.0a
3 999.960
4 000.040
±0.006 805
5 000.0a
4 999.950
5 000.050
±0.008 506
6 000.0a
5 999.940
6 000.060
±0.010 207
a. Option 006 only.
2-74
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies
Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
2. Source Power Range, Linearity, and Accuracy:
Path Loss Calculations Worksheet
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW Frequency
(MHz)
Source Output
Power Level
(dBm)
0.3
+10
20
+10
50
+10
100
+10
200
+10
500
+10
1 000
+10
2 000
+10
3 000
+10
4 000a
+10
5 000a
+10
6 000a
+10
First Value (dB)
Second Value
(dB)
Path Loss (dB)
a. Option 006 only.
Chapter 2
2-75
Performance Tests
Performance Test Records
Agilent Technologies
Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
2. Source Power Range, Linearity, and Accuracy:
Power Range and Linearity
Source Power
Level (dBm)
Power Offset
(dB)
Measured
Value (dB)
Power
Linearity
(dB)
Spec (dB)
Measurement
Uncertainty
CW Frequency = 300 kHz
−5
+15
±0.25
±0.02
−3
+13
±0.25
±0.02
−1
+11
±0.25
±0.02
+1
+9
±0.25
±0.02
+3
+7
±0.25
±0.02
+5
+5
±0.25
±0.02
+7
+3
±0.25
±0.0035
+9
+1
±0.25
±0.0022
+11
–1
±0.25
±0.0014
+13a
–3
±0.25
±0.0009
+13b
–3
±0.5
±0.0009
+15
–5
±0.5
±0.0006
+18
–8
±0.5
±0.17
+20a
–10
±0.5
±0.17
a. Analyzers without Option 006 only.
b. Option 006 only.
2-76
Chapter 2
Performance Tests
Performance Test Records
2. Source Power Range, Linearity, and Accuracy:
Power Range and Linearity (continued)
Source Power
Level (dBm)
Power Offset
(dB)
Measured
Value (dB)
Power
Linearity
(dB)
Spec (dB)
Measurement
Uncertainty
CW Frequency = 3 GHz
−5
+15
±0.25
±0.02
−3
+13
±0.25
±0.02
−1
+11
±0.25
±0.02
+1
+9
±0.25
±0.02
+3
+7
±0.25
±0.02
+5
+5
±0.25
±0.02
+7
+3
±0.25
±0.0035
+9
+1
±0.25
±0.0022
+11
–1
±0.25
±0.0014
+13a
–3
±0.25
±0.0009
+13b
–3
±0.5
±0.0009
+15
–5
±0.5
±0.0006
+18
–8
±0.5
±0.17
+20a
–10
±0.5
±0.17
a. Analyzers without Option 006 only.
b. Option 006 only.
Chapter 2
2-77
Performance Tests
Performance Test Records
2. Source Power Range, Linearity, and Accuracy:
Power Range and Linearity (continued)
Note: If your analyzer does not have Option 006, write “N/A” in all entries on this page.
Source Power
Level (dBm)
Power Offset
(dB)
Measured
Value (dB)
Power
Linearity
(dB)
Spec (dB)
Measurement
Uncertainty
CW Frequency = 6 GHz
−5
+15
±0.25
±0.02
−3
+13
±0.25
±0.02
−1
+11
±0.25
±0.02
+1
+9
±0.25
±0.02
+3
+7
±0.25
±0.02
+5
+5
±0.25
±0.02
+7
+3
±0.25
±0.0035
+9
+1
±0.25
±0.0022
+11
–1
±0.25
±0.0014
+13
–3
±0.5
±0.0009
+15
–5
±0.5
±0.0006
+18
–8
±0.5
±0.17
2-78
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
2. Source Power Range, Linearity, and Accuracy:
Power Level Accuracy
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW
Frequency
(MHz)
Path Loss
(dB)
Calibrated
Power
Level (dB)
Measured
Value (dB)
Power
Level
Accuracy
(dB)
Spec (dB)
Measurement
Uncertainty
(dB)
Source Output Power Level = +10 dBm
0.300
±1.0
±0.33
20.000
±1.0
±0.10
50.000
±1.0
±0.10
100.000
±1.0
±0.11
200.000
±1.0
±0.11
500.000
±1.0
±0.11
1 000.000
±1.0
±0.11
2 000.000
±1.0
±0.20
3 000.000
±1.0
±0.20
4 000.000a
±1.0
±0.17
5 000.000a
±1.0
±0.17
6 000.000a
±1.0
±0.17
a. Option 006 only.
Chapter 2
2-79
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
3. Receiver Minimum R Channel Level
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW Frequency
Specification
(dBm)
Marker Value (dB)
Measurement
Uncertainty
(dB)
300 kHz
< −35
±1.0
3.29 MHz
< −35
±1.0
3.31 MHz
< −35
±1.0
15.90 MHz
< −35
±1.0
16.10 MHz
< −35
±1.0
30.90 MHz
< −35
±1.0
31.10 MHz
< −35
±1.0
1.6069 GHz
< −35
±1.0
1.6071 GHz
< −35
±1.0
3.000 GHz
< −35
±1.0
4.000 GHza
< −30
±2.0
5.000 GHza
< −30
±2.0
6.000 GHza
< −30
±2.0
a. Option 006 only.
2-80
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
4. External Source Mode Frequency Range
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW Frequency
(MHz)
Results
10
20
100
1 000
2 900
4 000a
5 000a
6 000a
a. Option 006 only.
Chapter 2
2-81
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Option(s)
Date
5 and 6. Receiver Channel Noise Floor Level
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
Frequency Range
IF
Bandwidth
Specification
(dBm)
Calculated Value
Measurement
Uncertainty
Receiver Channel A
300 kHz–3.0 GHz
3 kHz
–90
±1
300 kHz–3.0 GHz
10 Hz
–110
±1
300 kHz–3.0 GHz
10 Hz
–110
±1
300 kHz–3.0 GHz
3 kHz
–90
±1
3.0 GHz–6.0 GHza
3 kHz
–85
±2
3.0 GHz–6.0 GHza
10 Hz
–105
±2
3.0 GHz–6.0 GHza
10 Hz
–105
±2
3.0 GHz–6.0 GHza
3 kHz
–85
±2
Receiver Channel B
Receiver Channel B
Receiver Channel A
a. Option 006 only.
2-82
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
7. Receiver Magnitude Frequency Response
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW
Frequency
Example
Power
Meter
Reading
–10.0
R Input
Power
–10.14
A Input
Power
–10.09
B Input
Power
–10.10
Greatest
Difference
0.14
Spec.
(dB)
Meas.
Uncer.
(dB)
±1
300 kHz
±1
±0.14
5 MHz
±1
±0.10
16 MHz
±1
±0.10
31 MHz
±1
±0.10
61 MHz
±1
±0.10
121 MHz
±1
±0.10
180 MHz
±1
±0.10
310 MHz
±1
±0.10
700 MHz
±1
±0.10
1.5 GHz
±1
±0.10
2.0 GHz
±1
±0.10
2.5 GHz
±1
±0.11
3.0 GHz
±1
±0.11
3.5 GHza
±2
±0.11
4.0 GHza
±2
±0.11
4.5 GHza
±2
±0.14
5.0 GHza
±2
±0.14
5.5 GHza
±2
±0.14
6.0 GHza
±2
±0.14
a. Option 006 only.
Chapter 2
2-83
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
8. Phase Frequency Response (Ratio)
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
Frequency Range
Ratio
Specification
Measured
Value
Measurement
Uncertainty
300 kHz–3 GHz
A/R
±3°
±0.61°
3 GHz–6 GHza
A/R
±10°
±1.54°
300 kHz–3 GHz
B/R
±3°
±0.61°
3 GHz–6 GHza
B/R
±10°
±1.54°
300 kHz–3 GHz
A/B
±3°
±0.61°
3 GHz–6 GHza
A/B
±10°
±1.54°
a. Option 006 only.
2-84
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
9. Receiver Input Crosstalk
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
Frequency Range
Specification
(dB)
Marker Value
Measurement
Uncertainty
R into A Crosstalk:
300 kHz–1.0 GHz
–100
±5.1 dΒ
1.0 GHz–3.0 GHz
–90
±5.1 dΒ
3.0 GHz–4.5 GHza
–82
±5.4 dΒ
4.5 GHz–6.0 GHza
–75
±5.4 dΒ
300 kHz–1.0 GHz
–100
±5.1 dΒ
1.0 GHz–3.0 GHz
–90
±5.1 dΒ
3.0 GHz–4.5 GHza
–82
±5.4 dΒ
4.5 GHz–6.0 GHza
–75
±5.4 dΒ
300 kHz–1.0 GHz
–100
±5.1 dΒ
1.0 GHz–3.0 GHz
–90
±5.1 dΒ
3.0 GHz–4.5 GHza
–82
±5.4 dΒ
4.5 GHz–6.0 GHza
–75
±5.4 dΒ
300 kHz–1.0 GHz
–100
±5.1 dΒ
1.0 GHz–3.0 GHz
–90
±5.1 dΒ
3.0 GHz–4.5 GHza
–82
±5.4 dΒ
4.5 GHz–6.0 GHza
–75
±5.4 dΒ
R into B Crosstalk:
B into A Crosstalk:
A into B Crosstalk:
a. Option 006 only.
Chapter 2
2-85
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
10. Receiver Trace Noise
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
Ratio
IF
BW
Phase/Magnitude
Measured Value
Specification
(rms)
Test Frequency: 3 GHz
≤0.001 dΒ
A/R
10 Hz
Magnitude
A/R
10 Hz
Phase
≤0.006°
A/R
3 kHz
Phase
≤0.038°
A/R
3 kHz
Magnitude
≤0.006 dΒ
B/R
3 kHz
Magnitude
≤0.006 dΒ
B/R
3 kHz
Phase
≤0.038°
B/R
10 Hz
Phase
≤0.006°
B/R
10 Hz
Magnitude
≤0.001 dΒ
Test Frequency: 6 GHz
2-86
≤0.002 dΒ
A/R
10 Hz
Magnitude
A/R
10 Hz
Phase
≤0.012°
A/R
3 kHz
Phase
≤0.070°
A/R
3 kHz
Magnitude
≤0.010 dΒ
B/R
3 kHz
Magnitude
≤0.010 dΒ
B/R
3 kHz
Phase
≤0.070°
B/R
10 Hz
Phase
≤0.012°
B/R
10 Hz
Magnitude
≤0.002 dΒ
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
11. Receiver Input Impedance
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
Frequency Range
B Return
Loss (A/R)
A Return
Loss (B/R)
R Return
Loss (A/B)
Specification
(dB)
Measurement
Uncertainty
(dB)
300 kHz–2 MHz
≥20
±0.6
2 MHz–1.3 GHz
≥24
±0.6
1.3 GHz–3 GHz
≥19
±0.6
3 GHz–6 GHza
≥15
±2.0
a. Option 006 only.
Chapter 2
2-87
2-88
HP/Agilent
8496A Attn.
(dB)
0
10
20
30
40
50
60
70
80
90
100
Test
Port
Power
(dBm)
−10
−20
−30
(ref)
−40
−50
−60
−70
−80
−90
−100
−110
Option(s)
Serial Number
Date
Report Number
Real Part
Imag. Part
Receiver
Measurement
(dB)
G
0.00
Expected
Measurement
(Corrected)
(dB)
F
Dynamic
Accuracy
(Calculated)
|G − F|
12. Test Port Receiver Magnitude Dynamic Accuracy (Channel B)
Agilent Technologies Company
Model 8753ES Option 011
±3.322
±1.203
±0.411
±0.152
±0.077
±0.054
±0.041
±0.031
±0.021
±0.033
±0.076
Spec.
(dB)
±0.027
±0.027
±0.017
±0.017
±0.017
±0.017
±0.008
±0.008
±0.008
±0.008
±0.008
Meas.
Uncer.
(dB)
Performance Tests
Performance Test Records
Chapter 2
Chapter 2
HP/Agilent
8496A Attn.
(dB)
0
10
20
30
40
50
60
70
80
90
100
Test
Port
Power
(dBm)
−10
−20
−30
(ref)
−40
−50
−60
−70
−80
−90
−100
−110
Option(s)
Serial Number
Date
Report Number
Real Part
Imag. Part
Receiver
Measurement
(dB)
G
0.00
Expected
Measurement
(Corrected)
(dB)
F
Dynamic
Accuracy
(Calculated)
|G − F|
12. Test Port Receiver Magnitude Dynamic Accuracy (Channel A)
Agilent Technologies Company
Model 8753ES Option 011
±3.322
±1.203
±0.411
±0.152
±0.077
±0.054
±0.041
±0.031
±0.021
±0.033
±0.076
Spec.
(dB)
±0.027
±0.027
±0.017
±0.017
±0.017
±0.017
±0.008
±0.008
±0.008
±0.008
±0.008
Meas.
Uncer.
(dB)
Performance Tests
Performance Test Records
2-89
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
13. Receiver Compression—Magnitude
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW Frequency
Start
Power
(dBm)
Stop Power
(dBm)
Measured
Value (dB)
Specification
Measurement
Uncertainty
300 kHz
≤0.55 dB
±0.05 dB
50 MHz
≤0.55 dB
±0.05 dB
1 GHz
≤0.55 dB
±0.05 dB
1.65 GHz
≤0.55 dB
±0.05 dB
2 GHz
≤0.55 dB
±0.05 dB
3 GHz
≤0.55 dB
±0.05 dB
4 GHza
≤0.87 dB
±0.05 dB
5 GHza
≤0.87 dB
±0.05 dB
6 GHza
≤0.87 dB
±0.05 dB
300 kHz
≤0.55 dB
±0.05 dB
50 MHz
≤0.55 dB
±0.05 dB
1 GHz
≤0.55 dB
±0.05 dB
1.65 GHz
≤0.55 dB
±0.05 dB
2 GHz
≤0.55 dB
±0.05 dB
3 GHz
≤0.55 dB
±0.05 dB
4 GHza
≤0.87 dB
±0.05 dB
5 GHza
≤0.87 dB
±0.05 dB
6 GHza
≤0.87 dB
±0.05 dB
Channel A
Channel B
a. Option 006 only.
2-90
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
14. Receiver Compression—Phase
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
CW Frequency
Start
Power
(dBm)
Stop Power
(dBm)
Measured
Value (dB)
Specification
(degrees)
Measurement
Uncertainty
(degrees)
Channel A
300 kHz
≤8.0
±0.30
50 MHz
≤8.0
±0.30
1 GHz
≤8.0
±0.30
1.65 GHz
≤8.0
±0.30
2 GHz
≤8.0
±0.30
3 GHz
≤8.0
±0.30
4 GHza
≤8.1
±0.30
5 GHza
≤8.1
±0.30
6 GHza
≤8.1
±0.30
300 kHz
≤8.0
±0.30
50 MHz
≤8.0
±0.30
1 GHz
≤8.0
±0.30
1.65 GHz
≤8.0
±0.30
2 GHz
≤8.0
±0.30
3 GHz
≤8.0
±0.30
4 GHza
≤8.1
±0.30
5 GHza
≤8.1
±0.30
6 GHza
≤8.1
±0.30
Channel B
a. Option 006 only.
Chapter 2
2-91
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
15. Source and Receiver Harmonics (Option 002 only)
Stop Frequency
(GHz)
Harmonic
Specification
(dBc)
Measured Value
Measurement
Uncertainty
(dB)
3
2nd
< –25
±1.5
2
3rd
< –25
±1.5
3
B: 2nd
< –15
±1.5
2
B: 3rd
< –30
±1.5
3
A: 2nd
< –15
±1.5
2
A: 3rd
< –30
±1.5
Source Harmonics
Receiver Harmonics
2-92
Chapter 2
Performance Tests
Performance Test Records
Agilent Technologies Company
Model 8753ES Option 011
Report Number
Serial Number
Date
16. Harmonic Measurement Accuracy (Option 002 only)
Note: If your analyzer does not have Option 006, write “N/A” in all entries above 3 GHz.
Analyzer
Frequency
Ext.
Source
Freq.
16 MHz
Power
Meter
Value
Spec.
(dB)
Meas.
Uncer.
(dB)
32 MHz
±1.5
±0.17
16 MHz
48 MHz
±1.5
±0.17
31 MHz
62MHz
±1.5
±0.17
31 MHz
93 MHz
±1.5
±0.17
61 MHz
122 MHz
±1.5
±0.17
61 MHz
183 MHz
±1.5
±0.17
121 MHz
242 MHz
±1.5
±0.17
121 MHz
363 MHz
±1.5
±0.17
180 MHz
360 MHz
±1.5
±0.17
180 MHz
540 MHz
±1.5
±0.17
310 MHz
620 MHz
±1.5
±0.17
310 MHz
930 MHz
±1.5
±0.17
700 MHz
1.4 GHz
±1.5
±0.17
700 MHz
2.1 GHz
±1.5
±0.17
1 GHz
2 GHz
±1.5
±0.17
1 GHz
3 GHz
±1.5
±0.17
1.5 GHz
3 GHz
±1.5
±0.17
2 GHz
4 GHz
±3
±0.17
2 GHz
6 GHz
±3
±0.22
3 GHz
6 GHz
±3
±0.22
Chapter 2
Input A
Value
Input B
Value
Max.
Diff.
2-93
Performance Tests
Performance Test Records
2-94
Chapter 2
3 Adjustments and Correction Constants
3-1
Adjustments and Correction Constants
This chapter contains the following adjustment procedures:
• A9 Switch Positions on page 3-6
• Source Default Correction Constants (Test 44) on page 3-7
• Source Pretune Default Correction Constants (Test 45) on page 3-8
• Analog Bus Correction Constants (Test 46) on page 3-9
• Source Pretune Correction Constants (Test 48) on page 3-10
• RF Output Power Correction Constants (Test 47) on page 3-11
• IF Amplifier Correction Constants (Test 51) on page 3-16
• ADC Offset Correction Constants (Test 52) on page 3-18
• Sampler Magnitude and Phase Correction Constants (Test 53) on page 3-19
• Cavity Oscillator Frequency Correction Constants (Test 54) on page 3-25
• Serial Number Correction Constants (Test 55) on page 3-30
• Option Numbers Correction Constants (Test 56) on page 3-31
• Initialize EEPROMs (Test 58) on page 3-32
• EEPROM Backup Disk Procedure on page 3-33
• Correction Constants Retrieval Procedure on page 3-34
• Loading Firmware on page 3-35
• Fractional-N Frequency Range Adjustment on page 3-39
• Frequency Accuracy Adjustment on page 3-42
• High/Low Band Transition Adjustment on page 3-45
• Fractional-N Spur Avoidance and FM Sideband Adjustment on page 3-47
• Source Spur Avoidance Tracking Adjustment on page 3-50
• Unprotected Hardware Option Numbers Correction Constants on page 3-52
3-2
Chapter 3
Adjustments and Correction Constants
Post-Repair Procedures
Post-Repair Procedures
Table 3-1 lists the additional service procedures which you must perform to ensure that
the instrument is working correctly, following the replacement of an assembly. Unless
otherwise noted, these procedures can be located in either Chapter 2 , “Performance Tests,”
or in this chapter, “Adjustments and Correction Constants.”
Perform the procedures in the order that they are listed in the table.
Table 3-1
Related Service Procedures
Replaced
Assembly
Adjustments/ Correction Constants
(Chapter 3)
Verification (Chapter 2)
A1 Front Panel
Keyboard
None
— Service Test 0 (Chapter 10)
— Service Test 23 (Chapter 10)
A2 Front Panel
Interface
None
—
—
—
—
A3 Source
—
—
—
—
—
—
—
A9 Switch Positions
Source Def CC (Test 44)
Pretune Default CC (Test 45)
Analog Bus CC (Test 46)
Source Pretune CC (Test 48)
RF Output Power CC (Test 47)
Sampler Magnitude and Phase CC
(Test 53)
— Cavity Oscillator Frequency CC
(Test 54)
— Source Spur Avoidance Tracking
— EEPROM Backup Disk
— Source Frequency Range and
Accuracy
— Source Power Range, Linearity, and
Accuracy
— Source and Receiver Harmonics
(Option 002 only)
A4/A5/A6
Samplers
— A9 Switch Positions
— Sampler Magnitude and Phase CC
(Test 53)
— IF Amplifier CC (Test 51)
— EEPROM Backup Disk
— Minimum R Channel Level
(if R sampler replaced)
— Receiver Input Crosstalk
— Receiver Magnitude Frequency
Response
A7 Pulse
Generator
— A9 Switch Positions
— Sampler Magnitude and Phase CC
(Test 53)
— EEPROM Backup Disk
— Receiver Magnitude Frequency
Response
— Source Frequency Range and
Accuracy
A8 Post
Regulator
— A9 Switch Positions
— Cavity Oscillator Frequency CC
(Test 54)
— Source Spur Avoidance Tracking
— EEPROM Backup Disk
— Service Test 0 (Chapter 10)
— Check A8 test point voltages
A9 CPU
(EEPROM
Backup Disk
Available)
—
—
—
—
—
— Operator's Check
Chapter 3
A9 Switch Positions
Load Firmware
Serial Number CC (Test 55)
Option Number CC (Test 56)
Correction Constants Retrieval
Service Test 0 (Chapter 10)
Service Test 23 (Chapter 10)
Service Test 12 (Chapter 10)
Tests 66–80
— Service Test 21 (Chapter 4)
— Service Test 22 (Chapter 4)
3-3
Adjustments and Correction Constants
Post-Repair Procedures
Table 3-1
Related Service Procedures
Replaced
Assembly
Adjustments/ Correction Constants
(Chapter 3)
Verification (Chapter 2)
A9 CPU
(EEPROM
Backup Disk Not
Available)
—
—
—
—
—
—
—
—
—
—
—
— Source Frequency Range and
Accuracy
— Source Power Range, Linearity, and
Accuracy
— Receiver Magnitude Dynamic
Accuracy
— Receiver Magnitude Frequency
Response
—
—
—
—
A9 Switch Positions
Load Firmware
Serial Number CC (Test 55)
Option Number CC (Test 56)
Source Def CC (Test 44)
Pretune Default CC (Test 45)
Analog Bus CC (Test 46)
ADC Linearity CC (Test 52)
Source Pretune CC (Test 48)
RF Output Power CC (Test 47)
Sampler Magnitude and Phase
CC (Test 53)
IF Amplifier CC (Test 51)
Cavity Oscillator Frequency CC
(Test 54)
Unprotected Hardware Option
Numbers CC
EEPROM Backup Disk
A10 Digital IF
—
—
—
—
A9 Switch Positions
Analog Bus CC (Test 46)
ADC Linearity CC (Test 52)
Sampler Magnitude and Phase
CC (Test 53)
— IF Amplifier CC (Test 51)
— EEPROM Backup Disk
— Receiver Channel Noise Floor Level
— Receiver Input Crosstalk
— Receiver Trace Noise
A11 Phase Lock
—
—
—
—
—
A9 Switch Positions
Analog Bus CC (Test 46)
Pretune Default CC (Test 45)
Source Pretune CC (Test 48)
EEPROM Backup Disk
— Minimum R Channel Level
— Source Frequency Range and
Accuracy
A12 Reference
—
—
—
—
A9 Switch Positions
High/Low Band Transition
Frequency Accuracy
EEPROM Backup Disk
— Source Frequency Range and
Accuracy
A13 Fractional-N
(Analog)
— A9 Switch Positions
— Fractional-N Spur Avoidance and
FM Sideband
— EEPROM Backup Disk
— Source Frequency Range and
Accuracy
A14 Fractional-N
(Digital)
— A9 Switch Positions
— Fractional-N Frequency Range
— Fractional-N Spur Avoidance and
FM Sideband
— EEPROM Backup Disk
— Source Frequency Range and
Accuracy
A15 Preregulator
None
— Self-Test (Chapter 4)
A16 Rear Panel
Interface
None
— None
3-4
Chapter 3
Adjustments and Correction Constants
Post-Repair Procedures
Table 3-1
Related Service Procedures
Replaced
Assembly
Adjustments/ Correction Constants
(Chapter 3)
Verification (Chapter 2)
A17 Motherboard
None
— Observation of Display
— Tests 66–80 (Chapter 10)
A18 Display
None
— Observation of Display
— Tests 66–80 (Chapter 10)
A19 Graphics
System Processor
None
— Observation of Display
— Tests 59–80 (Chapter 10)
A20 Disk Drive
None
None
A26 High
Stability Freq Ref
— Frequency Accuracy Adjustment
(Option 1D5)
— Source Frequency Range and
Accuracy
Chapter 3
3-5
Adjustments and Correction Constants
A9 Switch Positions
A9 Switch Positions
1. Remove the power line cord from the analyzer.
2. Set the analyzer on its side.
3. Remove the two lower-rear corner bumpers from the bottom of the instrument with the
T-10 TORX screwdriver.
4. Loosen the captive screw on the bottom cover's back edge, using a T-15 TORX
screwdriver.
5. Slide the cover toward the rear of the instrument.
6. Move the switch as shown in Figure 3-1:
• Move the A9 switch to the Alter position before you run any of the correction
constant adjustment routines. This is the position for altering the analyzer's
correction constants.
• Move the A9 switch to the Normal position, after you have run correction constant
adjustment routines. This is the position for normal operating conditions.
7. Reinstall the bottom cover, but not the rear bumpers.
Figure 3-1
A9 Correction Constants Switch
8. Reconnect the power line cord and switch on the instrument.
3-6
Chapter 3
Adjustments and Correction Constants
Source Default Correction Constants (Test 44)
Source Default Correction Constants (Test 44)
Analyzer warmup time: 30 minutes.
This internal adjustment routine writes default correction constants for the source power
accuracy.
1. Press Preset
YES .
System
SERVICE MENU
TESTS
44
x1
EXECUTE TEST
2. Observe the analyzer for the results of the adjustment routine:
• If the analyzer displays *Source Def DONE, you have completed this procedure.
• If the analyzer displays *Source Def FAIL, refer to Chapter 7 , “Source
Troubleshooting.”
Chapter 3
3-7
Adjustments and Correction Constants
Source Pretune Default Correction Constants (Test 45)
Source Pretune Default Correction Constants (Test 45)
Analyzer warmup time: 30 minutes.
This adjustment writes default correction constants for rudimentary phase lock pretuning
accuracy.
1. Press Preset
YES .
System
SERVICE MENU
TESTS
45
x1
EXECUTE TEST
2. Observe the analyzer for the results of this adjustment routine:
• If the analyzer displays Pretune Def DONE, you have completed this procedure.
• If the analyzer displays FAIL, refer to Chapter 7 , “Source Troubleshooting.”
3-8
Chapter 3
Adjustments and Correction Constants
Analog Bus Correction Constants (Test 46)
Analog Bus Correction Constants (Test 46)
Analyzer warmup time: 30 minutes.
This procedure calibrates the analog bus by using three reference voltages (ground, +0.37
and +2.5 volts), then stores the calibration data as correction constants in EEPROMs.
1. Press Preset
YES .
System
SERVICE MENU
TESTS
46
x1
EXECUTE TEST
2. Observe the analyzer for the results of the adjustment routine:
• If the analyzer displays ABUS Cor DONE, you have completed this procedure.
• If the analyzer displays ABUS Cor FAIL, refer to Chapter 6 , “Digital Control
Troubleshooting.”
Chapter 3
3-9
Adjustments and Correction Constants
Source Pretune Correction Constants (Test 48)
Source Pretune Correction Constants (Test 48)
Analyzer warmup time: 30 minutes.
This procedure generates pretune values for correct phase-locked loop operation.
1. Press Preset
YES .
System
SERVICE MENU
TESTS
48
x1
EXECUTE TEST
2. Observe the analyzer for the results of this adjustment routine:
• If the analyzer displays Pretune Cor DONE, you have completed this procedure.
• If the analyzer displays FAIL, refer to Chapter 7 , “Source Troubleshooting.”
3-10
Chapter 3
Adjustments and Correction Constants
RF Output Power Correction Constants (Test 47)
RF Output Power Correction Constants (Test 47)
This procedure adjusts several correction constants that can improve the output power
level accuracy of the internal source. They are related to the power level, power slope,
power slope offset, and the ALC roll-off factors among others.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Power meter
436A/437B/438A or E4418B/4419B
Power sensor
8482A
Power splitter (2)
11667A Option 001
Attenuator 20 dB
8491A Option 020
GPIB cable
10833A
RF cable 24-inch
11500B
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and earth ground wire
9300-0797
Additional Equipment for Option 006 Analyzers
Power sensor
8481A
Procedure
1. If you just completed “Sampler Magnitude and Phase Correction Constants (Test 53),”
start at step 8 in this procedure.
2. Press Preset
Local
SYSTEM CONTROLLER .
3. Press Local SET ADDRESSES ADDRESS: P MTR/GPIB . The default power meter
address is 13. Refer to the power meter manual as required to observe or change its
GPIB address.
4. Press POWER MTR:438A/437 to toggle between the HP/Agilent 438A/437 and 436A
power meters. Choose the appropriate model number. (Use the 438A/437 selection if the
power meter is an E4419B or E4418B.)
NOTE
Chapter 3
If you are using the 438A power meter, connect the 8482A power sensor to
channel A, and the 8481A power sensor to channel B.
3-11
Adjustments and Correction Constants
RF Output Power Correction Constants (Test 47)
Power Sensor Calibration Factor Entry
5. Zero and calibrate the power meter and power sensor.
6. Press System
SERVICE MENU TEST OPTIONS LOSS/SENSR LISTS
CAL FACTOR SENSOR A to access the calibration factor menu for power sensor A
(HP/Agilent 8482A for a 50Ω analyzer, or HP/Agilent 8483A Option H03 for a 75Ω
analyzer).
7. Build a table of up to 55 points (55 frequencies with their calibration factors). To enter
each point, follow these steps:
a. Press ADD FREQUENCY .
b. Input a frequency value and then press the appropriate key ( G/n , M/µ , or k/m ).
c. Press CAL FACTOR and enter the calibration factor percentage that corresponds to
the frequency you entered.
The cal factor and frequency values are found on the back of the sensor. If you make
a mistake, press
and re-enter the correct value.
d. Press DONE to complete the data entry for each point.
NOTE
The following terms are part of the sensor calibration menu.
SEGMENT
allows you to select a frequency point.
EDIT
allows you to edit or change a previously entered value.
DELETE
allows you to delete a point from the sensor cal factor table.
ADD
allows you to add a point into the sensor cal factor table.
CLEAR LIST allows you to erase the entire sensor cal factor table.
DONE
allows you to complete the points entry of the sensor cal
factor table.
8. For Option 006 Instruments Only: Press CAL FACTOR SENSOR B to create a
power sensor calibration table for power sensor B (8481A), using the softkeys
mentioned above. Since sensor B is only used for 3 GHz to 6 GHz measurements, you
only need to input calibration factors for this frequency range.
9. Connect the equipment as shown in Figure 3-2.
3-12
Chapter 3
Adjustments and Correction Constants
RF Output Power Correction Constants (Test 47)
Figure 3-2
Setup A for RF Output Correction Constants
10.Press Sweep Setup
CW FREQ
300
k/m .
11.Record the power meter reading in the first column of Table 3-2.
Table 3-2
Power Meter Readings
Setup A Reading
(First Reading)
Setup B Reading
(Second Reading)
Power Loss of #2
(Enter in Analyzer)
300 kHz: _______dB
minus _______dB
equals _______dB
50 MHz: _______dB
minus _______dB
equals _______dB
1.5 GHz: _______dB
minus _______dB
equals _______dB
3 GHz:_______ dB
minus _______dB
equals _______dB
6 GHza: _______dB
minus _______dB
equals _______dB
a. For Option 006 instruments only.
12.Repeat the previous two steps at 50 MHz, 1.5 GHz, and 3 GHz.
13.For Option 006 Instruments Only: Make a measurement at 6 GHz by disconnecting
the 8482A (sensor A) from the power splitter, and replacing it with the 8481A (sensor
B).
• If you are using the 438A power meter, the 8481A should be connected to the meter's
channel B input.
• If you are using the 437B power meter, zero and calibrate the 8481A sensor.
14.Reconfigure the equipment as shown in Figure 3-3.
Chapter 3
3-13
Adjustments and Correction Constants
RF Output Power Correction Constants (Test 47)
15.For Option 006 Instruments Only: Use the 8482A (sensor A) in the equipment
configuration.
• If you are using the 438A power meter, the 8482A should be connected to the meter's
channel A input.
• If you are using the 437B power meter, zero and calibrate the 8482A sensor.
Figure 3-3
Setup B for RF Output Correction Constants
16.Repeat the measurements at the same frequencies (300 kHz, 50 MHz, 1.5 GHz, 3 GHz)
and record the power meter readings in the second column in Table 11.
17.For Option 006 Instruments Only: Make a measurement at 6 GHz by disconnecting
the 8482A (sensor A) from the power splitter, and replacing it with the 8481A
(sensor B).
• If you are using the 438A power meter, the 8481A should be connected to the meter's
channel B input.
• If you are using the 437B power meter, zero and calibrate the 8481A sensor.
18.Subtract the power meter reading at each frequency in the second column from the
reading in the first column, and enter the difference in the third column.
19.Press System
SERVICE MENU
TEST OPTIONS
LOSS/SENSR LISTS
POWER LOSS and enter the power loss data in the same way you entered the
calibration factors.
3-14
Chapter 3
Adjustments and Correction Constants
RF Output Power Correction Constants (Test 47)
Source Correction Routine
20.Press DONE RETURN PWR LOSS ON to turn power loss ON.
21.Press RETURN TESTS
47
x1
EXECUTE TEST
YES .
22.Connect the equipment as shown in Figure 3-4, using splitter #2 and the power sensor
requested by the prompt.
Figure 3-4
Setup C for RF Output Correction Constants
23.Press CONTINUE .
24.Observe the analyzer display for the results of the adjustment routine:
• If the analyzer shows SOURCE Cor DONE, press Preset and you have completed this
procedure.
• If the analyzer fails this routine, refer to Chapter 7 , “Source Troubleshooting.”
Chapter 3
3-15
Adjustments and Correction Constants
IF Amplifier Correction Constants (Test 51)
IF Amplifier Correction Constants (Test 51)
This adjustment routine measures the gain of the IF amplifiers (A and B only) located on
the A10 digital IF, to determine the correction constants for absolute amplitude accuracy.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Power splitter
11667A Option 001
RF cable (2)
11500B
Attenuator, 20 dB, type-N
8491A, Option 020
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and earth ground wire
9300-0797
1. Connect the equipment as shown in Figure 3-5, using the analyzer's A input.
Figure 3-5
Setup for IF Amplifier Correction Constants
2. Press Preset
System
SERVICE MENU
TESTS
51
x1
EXECUTE TEST
YES
CONTINUE .
3. Connect the equipment as shown in Figure 3-5, using the analyzer's B input.
3-16
Chapter 3
Adjustments and Correction Constants
IF Amplifier Correction Constants (Test 51)
4. Press CONTINUE and observe the analyzer for the results of the adjustment routine:
• If DONE is displayed, you have completed this procedure.
• If FAIL is displayed, check that the RF cable is connected between Port 1 and Port 2.
Then, repeat this adjustment routine.
• If the analyzer continues to fail the adjustment routine, refer to Chapter 6 , “Digital
Control Troubleshooting.”
Chapter 3
3-17
Adjustments and Correction Constants
ADC Offset Correction Constants (Test 52)
ADC Offset Correction Constants (Test 52)
Analyzer warmup time: 30 minutes.
These correction constants improve the dynamic accuracy by shifting small signals to the
most linear part of the ADC quantizing curve.
1. Press Preset
YES .
NOTE
System
SERVICE MENU
TESTS
52
x1
EXECUTE TEST
This routine takes about three minutes.
2. Observe the analyzer for the results of the adjustment routine:
• If the analyzer displays ADC Ofs Cor DONE, you have completed this procedure.
• If the analyzer displays ADC Ofs Cor FAIL, refer to Chapter 6 , “Digital Control
Troubleshooting.”
3-18
Chapter 3
Adjustments and Correction Constants
Sampler Magnitude and Phase Correction Constants (Test 53)
Sampler Magnitude and Phase Correction Constants
(Test 53)
This adjustment procedure corrects the overall flatness of the microwave components that
make up the analyzer receiver and signal separation sections. This is necessary for the
analyzer to meet the published test port flatness specification.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Power Meter
436A/437B/438A or E4418B/4419B
Power Sensor
8482A
Power Sensor (for Option 006 analyzers)
8481A
GPIB Cable
10833A
Power splitter
11667A Option 001
RF cable set (2)
11500B
Adapter type-N (m) to type-N (m)
1250-1475
Adapter type-N (f) to type-N (f)
1250-1472
Antistatic Wrist Strap
9300-1367
Antistatic Wrist Strap Cord
9300-0980
Static-control Mat and Ground Wire
9300-0797
Procedure
1. If you just completed “RF Output Power Correction Constants (Test 47),” continue this
procedure with step 8.
2. Press Preset
Local
SYSTEM CONTROLLER .
3. Press Local SET ADDRESSES ADDRESS: P MTR/GPIB . The default power meter
address is 13. Refer to the power meter manual as required to observe or change its
GPIB address.
4. Press POWER MTR:438A/437 to toggle between the 438A/437 and 436A power meters.
Choose the appropriate model number. (Use the 438A/437 selection if the power meter
is an E4419B or E4418B.)
NOTE
Chapter 3
If you are using the 438A or E4419B power meter, connect the 8482A power
sensor to channel A, and the 8481A power sensor to channel B (for adjusting
analyzers with Option 006).
3-19
Adjustments and Correction Constants
Sampler Magnitude and Phase Correction Constants (Test 53)
Power Sensor Calibration Factor Entry
5. Press System
SERVICE MENU TEST OPTIONS LOSS/SENSR LISTS
CAL FACTOR SENSOR A to access the calibration factor menu for power sensor A.
6. Build a table of up to 55 points (55 frequencies with their calibration factors). To enter
each point, follow these steps:
a. Press ADD FREQUENCY .
b. Input a frequency value and then press the appropriate key ( G/n , M/µ , or k/m ).
c. Press CAL FACTOR and enter the calibration factor percentage that corresponds to
the frequency you entered.
The cal factor and frequency values are found on the back of the sensor. If you make
a mistake, press
and re-enter the correct value.
d. Press DONE to complete the data entry for each point.
NOTE
The following terms are part of the sensor calibration menu.
SEGMENT
allows you to select a frequency point.
EDIT
allows you to edit or change a previously entered value.
DELETE
allows you to delete a point from the sensor cal factor table.
ADD
allows you to add a point into the sensor cal factor table.
CLEAR LIST allows you to erase the entire sensor cal factor table.
DONE
allows you to complete the points entry of the sensor cal
factor table.
7. For Option 006 Instruments Only: Press CAL FACTOR SENSOR B to create a
power sensor calibration table for power sensor B (8481A), using the softkeys
mentioned previously. Since sensor B is only used for 3 GHz to 6 GHz measurements,
you only need to input calibration factors for this frequency range.
8. Zero and calibrate the power meter and power sensor.
Update Sampler Correction Constants
9. Preset, zero, and calibrate the power meter and 8482A (sensor A).
10.Press System
SERVICE MENU
TESTS
53
x1
EXECUTE TEST
YES .
11.Connect the equipment as shown in Figure 3-6.
3-20
Chapter 3
Adjustments and Correction Constants
Sampler Magnitude and Phase Correction Constants (Test 53)
Figure 3-6
Input R Sampler Correction Setup
12.Press CONTINUE .
The analyzer starts the first part of the automatic adjustment. This part will take about
seven minutes.
13.For Option 006 Instruments Only: After the analyzer has finished the first part of
the adjustment, disconnect the 8482A (sensor A) from the power splitter, and replace it
with the 8481A (sensor B) for the 6 GHz measurement.
• If you are using the 438A power meter, the 8481A should be connected to the meter's
channel B input.
• If you are using the 437B power meter, zero and calibrate the 8481A sensor.
14.Press CONTINUE .
15.Connect the equipment as shown in Figure 3-7. Use two cables of equal electrical length
at the power splitter outputs.
Chapter 3
3-21
Adjustments and Correction Constants
Sampler Magnitude and Phase Correction Constants (Test 53)
Figure 3-7
Input A Sampler Correction Setup
16.Press CONTINUE . The analyzer starts the second part of the automatic adjustment.
17.Follow the analyzer prompt to move the cable from input A to input B, as shown in
Figure 3-8.
Figure 3-8
Input B Sampler Correction Setup
18.Press CONTINUE . The analyzer starts the third part of the automatic adjustment.
19.When the analyzer completes the adjustment, observe the display:
• If the analyzer shows DONE, this procedure is complete.
• If the analyzer shows FAIL, it is necessary to adjust the sampler offset values, which
are stored in EEPROM. Each sampler will require its own offset which is determined
by performing the following procedure for each sampler.
3-22
Chapter 3
Adjustments and Correction Constants
Sampler Magnitude and Phase Correction Constants (Test 53)
Sampler Offset Adjustment
1. Connect the equipment as shown in Figure 3-9. The setup is configured to test the R
and B samplers. To test the A sampler, disconnect the cable from the B input and
connect it to the A input.
Figure 3-9
Sampler Offset Test
2. Press Preset
Start
3. Press Power
6
4. Press Meas
100
k/m .
x1 .
INPUT PORTS (specific sampler A, B, or R).
5. Press System
CONFIGURE MENU
6. Press Marker
MARKER 1
RAW OFFSET OFF .
Marker Search
SEARCH: MAX .
7. Read the value of marker 1, (along with its algebraic value), and perform the following
calculation:
• Subtract the marker value from 4.0.
• Multiply the result by 4.0.
• Round the result to the nearest integer.
8. Record this number for each sampler.
Chapter 3
3-23
Adjustments and Correction Constants
Sampler Magnitude and Phase Correction Constants (Test 53)
9. Update the offsets for each sampler:
A-Channel Sampler
a. Access the first address by pressing System
PEEK/POKE ADDRESS
1619001372
SERVICE MENU
PEEK/POKE
x1 .
b. Enter the new value for the A-sampler at the accessed address by pressing POKE
[new value for A] x1 .
c. Press Preset
for the analyzer to use the new values.
B-Channel Sampler
a. Access the first address by pressing System
PEEK/POKE ADDRESS
1619001374
SERVICE MENU
PEEK/POKE
x1 .
b. Enter the new value for the B-sampler at the accessed address by pressing POKE
[new value for B] x1 .
c. Press Preset
for the analyzer to use the new values.
R-Channel Sampler
a. Access the first address by pressing System
PEEK/POKE ADDRESS
1619001376
SERVICE MENU
PEEK/POKE
x1 .
b. Enter the new value for the R-sampler at the accessed address by pressing POKE
[new value for R] x1 .
c. Press Preset
for the analyzer to use the new values.
10.Repeat this adjustment procedure.
11.If the analyzer continues to fail this adjustment routine, refer to Chapter 8 , “Receiver
Troubleshooting.”
3-24
Chapter 3
Adjustments and Correction Constants
Cavity Oscillator Frequency Correction Constants (Test 54)
Cavity Oscillator Frequency Correction Constants (Test 54)
The nominal frequency of the cavity oscillator is 2.982 GHz, but it varies with
temperature. This procedure determines the precise frequency of the cavity oscillator at a
particular temperature by identifying a known spur.
Analyzer warmup time: 30 minutes.
NOTE
You should perform this procedure with the recommended filter, or a filter
with at least 50 dB of rejection at 2.9 GHz, and a passband which includes
800 MHz. The filter makes spur identification substantially faster and more
reliable.
With the filter, you need to distinguish between only two spurs, each of which should be
10 dB to 20 dB (3 to 4 divisions) above the trace noise.
Without the filter, you need to distinguish the target spur between four or five spurs, each
of which may be 0.002 to 0.010 dB (invisible to 2 divisions) above or below the trace noise.
Perform the first five steps of the procedure at least once for familiarization before trying
to select the target spur (especially if you are not using a filter).
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Low pass filter (used with the adapters below)
9135-0198
Adapter type-N (m) to SMA (f)
1250-1250
Adapter type-N (f) to SMA (m)
1250-1562
Power splitter
1667A Option 001
Attenuator 20 dB
8491A Option 020
RF cable set
11851B
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and ground wire
9300-0797
Chapter 3
3-25
Adjustments and Correction Constants
Cavity Oscillator Frequency Correction Constants (Test 54)
Procedure
1. Connect the equipment shown in Figure 3-10.
Figure 3-10
Setup for Cavity Oscillator Frequency Correction Constant
Routine
2. Press Preset
x1
Avg
IF BW
EXECUTE TEST
3000
x1
System
SERVICE MENU
TESTS
54
YES .
During this adjustment routine, you will see several softkeys:
CONTINUE
sweeps the current frequency span; you may
press it repeatedly for additional sweeps of the
current frequency span.
NEXT
sweeps the next frequency span (2 MHz higher).
SELECT
enters the value of the marker (which you have
placed on the spur) and exits the routine.
ABORT
exits the routine.
3. Press CONTINUE to sweep the first frequency span three times. Each new span
overlaps the previous span by 3 MHz (the center frequency increases by 2 MHz; the
span is 5 MHz). Therefore, anything visible on the right half of the screen of one set of
sweeps will appear on the left half or center of the screen when you press NEXT .
3-26
Chapter 3
Adjustments and Correction Constants
Cavity Oscillator Frequency Correction Constants (Test 54)
4. Press NEXT repeatedly. Watch the trace on each sweep and try to spot the target spur.
With the filter, the target spur will be one of two obvious spurs (see Figure 3-11).
Without the filter (not recommended), the target spur will be one of four or five less
distinct spurs as shown in Figure 3-12 and Figure 3-13. When the center frequency
increases to 2994.999 MHz, and you have not “selected” the target spur, the message
Cav Osc Cor FAIL will appear on the display.
Figure 3-11
Typical Display of Spurs with a Filter
Spur Search Procedure with a Filter
5. Press EXECUTE TEST YES CONTINUE and the other softkeys as required to
observe and mark the target spur. The target spur will appear to the right of a second
spur, similar to Figure 3-11.
6. Rotate the front panel knob to position the marker on the spur and then press
SELECT .
7. Observe the analyzer for the results of this adjustment routine:
• If the analyzer displays Cav Osc Cor DONE, you have completed this procedure.
• If the analyzer does not display DONE, repeat this procedure.
• If the analyzer continues not to display DONE, refer to Chapter 7 , “Source
Troubleshooting.”
Chapter 3
3-27
Adjustments and Correction Constants
Cavity Oscillator Frequency Correction Constants (Test 54)
Spurs Search Procedure without a Filter
8. Press EXECUTE TEST YES CONTINUE and the other softkeys as required to
observe and mark the target spur.
9. The target spur will appear in many variations. Often it will be difficult to identify
positively; occasionally it will be nearly impossible to identify. Do not hesitate to press
CONTINUE as many times as necessary to thoroughly inspect the current span.
The target spur usually appears as one of a group of four evenly spaced spurs as in
Figure 3-12. The target spur is the right most spur (fourth from the left). On any
particular sweep, one, any, or all of the spurs may be large, small, visible, invisible,
above or below the reference line.
Figure 3-12
Typical Display of Four Spurs without a Filter
On occasion the largest spur appears as one of a group of five evenly spaced spurs as
shown in Figure 3-13. The target spur is again the fourth from the left (not the fifth,
right-most spur).
3-28
Chapter 3
Adjustments and Correction Constants
Cavity Oscillator Frequency Correction Constants (Test 54)
Figure 3-13
Target Spur Is Fourth in Display of Five Spurs
Figure 3-14 shows another variation of the basic four-spur pattern: some up, some down,
and the target spur itself almost indistinguishable.
Figure 3-14
Target Spur Is Almost Invisible
10.Rotate the front panel knob to position the marker on the target spur. Then press
SELECT and observe the analyzer for the results of the adjustment routine:
• If the analyzer displays Cav Osc Cor DONE, you have completed this procedure.
• If the analyzer displays FAIL, refer to Chapter 7 , “Source Troubleshooting.”
Chapter 3
3-29
Adjustments and Correction Constants
Serial Number Correction Constants (Test 55)
Serial Number Correction Constants (Test 55)
Analyzer warmup time: 5 minutes.
This procedure stores the analyzer serial number in the A9 CPU assembly EEPROMs.
CAUTION
Perform this procedure only if the A9 CPU assembly has been replaced.
1. Record the ten character serial number that is on the analyzer’s rear panel
identification label.
2. Press Preset
logo.
DISPLAY MORE
TITLE
ERASE TITLE to erase the HP/Agilent
3. Enter the serial number with an external keyboard or by rotating the front panel knob
to position the arrow below each character of the instrument serial number, and then
pressing SELECT LETTER to enter each letter.
Press
if you made a mistake.
4. Press DONE when you have finished entering the title.
CAUTION
You cannot correct mistakes after you perform step 5, unless you contact the
factory for a clear-serial-number keyword. Then you must perform the
“Option Numbers Correction Constants (Test 56)” on page 3-31 and repeat
this procedure.
5. Press System
SERVICE MENU
TESTS
55
x1
EXECUTE TEST
YES .
6. Observe the analyzer for the results of the routine:
• If the analyzer displays the message Serial Cor DONE, you have completed this
procedure.
• If the analyzer does not display DONE, then either the serial number that you entered
in steps 3 and 4 did not match the required format or a serial number was already
stored. Check the serial number recognized by the analyzer:
a. Press Preset
System
SERVICE MENU
FIRMWARE REVISION .
b. Look for the serial number displayed on the analyzer screen.
c. Repeat this adjustment test.
• If the analyzer continues to fail this adjustment routine, contact the nearest Agilent
Technologies sales or service office.
3-30
Chapter 3
Adjustments and Correction Constants
Option Numbers Correction Constants (Test 56)
Option Numbers Correction Constants (Test 56)
This procedure stores instrument option(s) information in A9 CPU assembly EEPROMs.
You can also use this procedure to remove a serial number, with the unique keyword, as
referred to in “Serial Number Correction Constants (Test 55)” on page 3-30.
1. Remove the instrument top cover and record the keyword label(s) that are on the
display assembly. Note that each keyword is for each option installed in the instrument.
• If the instrument does not have a label, then contact your nearest Agilent
Technologies sales or service office. Be sure to include the full serial number of the
instrument.
2. Press Preset
Display
MORE
TITLE
ERASE TITLE .
3. Enter the keyword with an external keyboard or by rotating the front panel knob to
position the arrow below each character of the keyword, and then pressing
SELECT LETTER to enter each letter.
Press
if you made a mistake.
4. Press DONE when you have finished entering the title.
CAUTION
Do not confuse “I” with “1” (one) or “O” with “0” (zero).
5. Press System
SERVICE MENU
TESTS
56
x1
EXECUTE TEST
YES .
6. Observe the analyzer for the results of the adjustment routine:
• If the analyzer displays Option Cor DONE, you have completed this procedure.
• If the analyzer has more than one option, repeat steps 2 through 5 to install the
remaining options.
• If the analyzer displays Option Cor FAIL, check the keyword used in step 3 and
make sure it is correct. Pay special attention to the letters “I” or “0”, the numbers “1”
or “0” (zero). Repeat this entire adjustment test.
• If the analyzer continues to fail the adjustment routine, contact the nearest Agilent
Technologies sales or service office.
Chapter 3
3-31
Adjustments and Correction Constants
Initialize EEPROMs (Test 58)
Initialize EEPROMs (Test 58)
This service internal test performs the following functions:
• Destroys all correction constants and all unprotected options.
• Initializes certain EEPROM address locations to zeroes.
NOTE
This routine will not alter the serial number or Options 002, 006 and 010
correction constants.
1. Make sure the A9 switch is in the alter position.
2. Press Preset
YES .
System
SERVICE MENU
TESTS
58
x1
EXECUTE TEST
3. Restore the analyzer correction constants in the EEPROMs:
• If you have the correction constants backed up on a disk, perform these steps:
a. Place the disk in the analyzer disk drive and press Save/Recall
INTERNAL DISK .
SELECT DISK
b. Use the front panel knob to highlight the file name that represents your serial
number.
c. Press RETURN RECALL STATE
Preset .
• If you don't have the correction constants backed up on a disk, run all the internal
service routines in the following order:
— Source Default Correction Constants (Test 44)
— Source Pretune Correction Constants (Test 45)
— Analog Bus Correction Constants (Test 46)
— ADC Offset Correction Constants (Test 52)
— Source Pretune Correction Constants (Test 48)
— RF Output Power Correction Constants (Test 47)
— Sampler Magnitude and Phase Correction Constants (Test 53)
— IF Amplifier Correction Constants (Test 51)
— Cavity Oscillator Frequency Correction Constants (Test 54)
— Unprotected Hardware Option Numbers CC
— EEPROM Backup Disk Procedure
3-32
Chapter 3
Adjustments and Correction Constants
EEPROM Backup Disk Procedure
EEPROM Backup Disk Procedure
The correction constants, which are unique to your instrument, are stored in EEPROM on
the A9 controller assembly. By creating an EEPROM backup disk, you will have a copy of
all the correction constant data should you need to replace or repair the A9 assembly.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
3.5-inch Floppy Disk
One formatted 1.44 MB disk
Antistatic Wrist Strap
9300-1367
Antistatic Wrist Strap Cord
9300-0980
Static-control Table Mat and Ground Wire
9300-0797
Procedure
1. Insert a 3.5-inch disk into the analyzer disk drive.
2. If the disk is not formatted, follow these steps:
a. Press Save/Recall
FILE UTILITIES
FORMAT DISK .
b. Select the format type:
• To format a LIF disk, select FORMAT:LIF .
• To format a DOS disk, select FORMAT:DOS .
c. Press FORMAT INT DISK and answer YES at the query.
3. Press System
Save/Recall
NOTE
SERVICE MENU
SELECT DISK
SERVICE MODES
INTERNAL DISK
MORE
RETURN
STORE EEPR ON
SAVE STATE .
The analyzer creates a default file “FILE0”. The file name appears in the
upper-left corner of the display. The file type “ISTATE(E)” indicates that the
file is an instrument-state with EEPROM backup.
4. Press FILE UTILITIES RENAME FILE ERASE TITLE . Use the front panel knob
and the SELECT LETTER softkey (or an external keyboard) to rename the file
“FILE0” TO “N12345” where 12345 represents the last 5 digits of the instrument's
serial number. (The first character in the file name must be a letter.) When you are
finished renaming the file, press DONE .
5. Write the following information on the disk label:
• analyzer serial number
• today's date
• “EEPROM Backup Disk”
Chapter 3
3-33
Adjustments and Correction Constants
Correction Constants Retrieval Procedure
Correction Constants Retrieval Procedure
Required Equipment and Tools
Description
HP/Agilent Part Number
EEPROM backup disk
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and earth ground wire
9300-0797
By using the current EEPROM backup disk, you can download the correction constants
data into the instrument EEPROMs.
1. Insert the “EEPROM Backup Disk” into the analyzer’s disk drive.
2. Make sure the A9 switch is in the Alter position.
3. Press Save/Recall SELECT DISK INTERNAL DISK . Use the front panel knob to
highlight the file “N12345” where N12345 represents the file name of the EEPROM
data for the analyzer. On the factory shipped EEPROM backup disk, the file name is
“FILE1”.
4. Press RETURN RECALL STATE to download the correction constants data into the
instrument EEPROMs.
5. Press Preset and verify that good data was transferred to EEPROM by performing a
simple measurement.
6. Move the A9 switch back to the Normal position when you are done working with the
instrument.
3-34
Chapter 3
Adjustments and Correction Constants
Loading Firmware
Loading Firmware
The following procedures will load firmware for new or existing CPU boards in your
network analyzer.
Analyzer warmup time: None required.
Required Equipment and Tools
Firmware disk for the 8753ES
Loading Firmware into an Existing CPU
Use this procedure for upgrading firmware in an operational instrument whose CPU board
has not been changed.
CAUTION
Loading firmware will clear all internal memory. Perform steps 1 through 5,
next, to save any instrument states that are stored in internal memory to a
floppy disk. If saving states is not necessary, proceed to step 6.
1. Press Save/Recall
SELECT DISK
INTERNAL MEMORY
RETURN .
2. Select an instrument state and press RECALL STATE .
3. Press SELECT DISK INTERNAL DISK RETURN SAVE STATE .
4. If the instrument state file was not saved to disk with the same name that it had while
in internal memory, you may wish to rename the file:
Press FILE UTILITIES RENAME FILE , enter the desired name, and press DONE .
5. Repeat steps 1 through 4 for each instrument state that you wish to save.
6. Turn off the network analyzer.
7. Insert the firmware disk into the instrument's disk drive.
8. Turn the instrument on. The firmware will be loaded automatically during power-on.
The front panel LEDs should step through a sequence as firmware is loaded. The
display will be blank during this time.
At the end of a successful loading, the LEDs for Channel 1 and Testport 1 will remain
on and the display will turn on indicating the version of firmware that was loaded.
Chapter 3
3-35
Adjustments and Correction Constants
Loading Firmware
In Case of Difficulty
If the firmware did not load successfully, LED patterns on the front panel can help you
isolate the problem.
• If the following LED pattern is present, an acceptable firmware file name was not found
on the disk. (The desired format for firmware filenames is 8753ES.07._yz, where
yz = the latest firmware revision number.) Check that the firmware disk used was for
the 8753ES.
LED Pattern
CH1
CH2
✲
✲
R
L
T
S
• If any of the following LED patterns are present, the firmware disk may be defective.
LED Pattern
CH1
CH2
R
L
T
S
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
• If any other LED pattern is present, the CPU board is defective.
3-36
Chapter 3
Adjustments and Correction Constants
Loading Firmware
Loading Firmware into a New CPU
Use this procedure to load firmware for an instrument whose CPU board has been
replaced.
1. Turn off the network analyzer.
2. Insert the firmware disk into the instrument's disk drive.
3. Turn the instrument on. The firmware will be loaded automatically during power-on.
The front panel LEDs should step through a sequence as firmware is loaded. The
display will be blank during this time.
At the end of a successful loading, the LEDs for Channel 1 and Testport 1 on an will
remain on and the display will turn on indicating the version of firmware that was
loaded.
In Case of Difficulty
• If the firmware did not load successfully, LED patterns on the front panel can help you
isolate the problem.
— If the following LED pattern is present, an acceptable firmware file name was not
found on the disk. (The desired format for firmware filenames is 8753ES.07._yz,
where yz = the latest firmware revision number.) Check that the firmware disk used
was for the 8753ES.
LED Pattern
CH1
CH2
R
L
T
S
✲
Chapter 3
3-37
Adjustments and Correction Constants
Loading Firmware
— If any of the following LED patterns are present, the firmware disk may be defective.
LED Pattern
CH1
CH2
R
L
T
S
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
✲
— If any other LED pattern is present, the CPU board is defective.
NOTE
If firmware did not load, a red LED on the CPU board will be flashing.
• If the following LED pattern is present on the CPU board, suspect the disk drive or
associated cabling:
✲
✲
✲
O
✲
✲
O
O
(front of instrument ⇓)
3-38
Chapter 3
Adjustments and Correction Constants
Fractional-N Frequency Range Adjustment
Fractional-N Frequency Range Adjustment
This procedure centers the fractional-N VCO (voltage controlled oscillator) in its tuning
range to insure reliable operation of the instrument.
Analyzer warmup time: 30 minutes
Required Equipment and Tools
Description
HP/Agilent Part Number
Non-metallic adjustment tool
8830-0024
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and ground wire
9300-0797
TORX T-15 screwdriver
Procedure
1. Remove the right-rear bumpers and right side cover.
2. Press Preset
Display
SERVICE MENU
k/m
Meas
36
System
ANALOG BUS ON
NUMBER OF POINTS
3. Press Start
DUAL|QUAD SETUP DUAL CHAN ON
M/µ
11
Stop
x1
Sweep Setup
COUPLED CH OFF .
60.75
M/µ
SWEEP TIME
Sweep Setup
S PARAMETERS ANALOG IN Aux Input
29
12.5
x1 to observe the “FN
VCO Tun” voltage.
4. Press Format MORE REAL Scale Ref .6 x1 REFERENCE VALUE −7
x1 to set and scale channel 1. Press Marker to set the marker to the far right of the
graticule.
5. Press Chan 2
k/m
Meas
Sweep Setup CW FREQ 31.0001
M/µ
S PARAMETERS ANALOG IN Aux Input
SWEEP TIME
29
12.375
x1 to observe the “FN
VCO Tun” voltage.
6. Press Format
x1
Marker
MORE
6
REAL
Scale Ref
.2
x1
REFERENCE VALUE
6.77
k/m to set channel 2 and its marker.
7. Adjust the “FN VCO TUNE” (see Figure 3-15) with a non-metallic tool so that the
channel 1 marker is as many divisions above the reference line as the channel 2 marker
is below it. (See Figure 3-16.)
8. To fine-tune this adjustment, press Preset
SERVICE MENU
ANALOG BUS ON
Sweep Setup CW FREQ System
SERVICE MODES FRACN TUNE ON to set
“FRAC N TUNE” to 29.2 MHz.
Chapter 3
3-39
Adjustments and Correction Constants
Fractional-N Frequency Range Adjustment
Figure 3-15
Location of the FN VCO TUNE Adjustment
Figure 3-16
Fractional-N Frequency Range Adjustment Display
9. Press Meas
MORE
3-40
S PARAMETERS ANALOG IN Aux Input
REAL
Scale Ref
REFERENCE VALUE
7
29
x1
Marker
Format
x1 .
Chapter 3
Adjustments and Correction Constants
Fractional-N Frequency Range Adjustment
10.Observe the analyzer for the results of this adjustment:
• If the marker value is less than 7, you have completed this procedure.
• If the marker value is greater than 7, readjust “FN VCO ADJ” to 7. Then perform
steps 2 to 10 to confirm that the channel 1 and channel 2 markers are still above and
below the reference line respectively.
• If you cannot adjust the analyzer correctly, replace the A14 board assembly.
Chapter 3
3-41
Adjustments and Correction Constants
Frequency Accuracy Adjustment
Frequency Accuracy Adjustment
This adjustment sets the VCXO (voltage controlled crystal oscillator) frequency to
maintain the instrument's frequency accuracy.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Spectrum analyzer
8563E
Power splitter
11667A Option 001
RF cable 24-inch (2)
11500B
Non-metallic adjustment tool
8830-0024
TORX screwdriver T-15
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and earth ground wire
9300-0797
1. Remove the upper-rear bumpers and analyzer top cover.
2. Connect the equipment as shown in Figure 3-17.
Figure 3-17
3-42
Frequency Accuracy Adjustment Setup
Chapter 3
Adjustments and Correction Constants
Frequency Accuracy Adjustment
NOTE
Make sure that the spectrum analyzer and network analyzer references are
not connected.
3. For Option 1D5 Instruments Only: Remove the BNC-to-BNC jumper that is
connected between the “EXT REF” and the “10 MHz Precision Reference,” as shown in
Figure 3-19.
4. Set the spectrum analyzer measurement parameters as follows:
Spectrum Analyzer
Parameter
Network Analyzer without
Option 006
Network Analyzer with
Option 006
Frequency
3 GHz
6 GHz
Span
60 kHz
120 kHz
Amplitude Ref Level
10 dBm
10 dBm
5. On the network analyzer, press Preset
G/n for Option 006).
Sweep Setup
CW FREQ
3
G/n
(or 6
6. No adjustment is required if the spectrum analyzer measurement is within the
following specifications:
• ± 30 kHz for analyzers without Option 006
• ± 60 kHz for analyzers with Option 006
Otherwise, locate the A12 assembly (red extractors) and adjust the VCXO ADJ (see
Figure 3-18) for a spectrum analyzer center frequency measurement within
specifications.
7. Replace the A12 assembly if you are unable to adjust the frequency as specified. Repeat
this adjustment test.
Figure 3-18
Chapter 3
Location of the VCXO ADJ Adjustment
3-43
Adjustments and Correction Constants
Frequency Accuracy Adjustment
NOTE
To increase the accuracy of this adjustment, the following steps are
recommended.
8. Replace the instrument covers and wait 15 minutes in order to allow the analyzer to
reach its precise operating temperature.
9. Recheck the CW frequency and adjust if necessary.
Instruments with Option 1D5 Only
10.Reconnect the BNC-to-BNC jumper between the “EXT REF” and the “10 MHz Precision
Reference” as shown in Figure 3-19.
Figure 3-19
High Stability Frequency Adjustment Location
11.Insert a narrow screwdriver and adjust the high-stability frequency reference
potentiometer for a CW frequency measurement within specification.
In Case of Difficulty
Replace the A26 assembly if you cannot adjust the CW frequency within specification.
3-44
Chapter 3
Adjustments and Correction Constants
High/Low Band Transition Adjustment
High/Low Band Transition Adjustment
This adjustment centers the VCO (voltage controlled oscillator) of the A12 reference
assembly for high and low band operations.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Non-metallic adjustment tool
8830-0024
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and earth ground wire
9300-0797
Procedure
1. Press Preset
Stop
21
2. Press Meas
REAL
System
SERVICE MENU
ANALOG BUS ON
Start
11
M/µ
M/µ to observe part of both the low and high bands on the analog bus.
S PARAMETERS ANALOG IN Aux Input
Display
DATA→MEM
22
x1
Format
MORE
DATA−MEMORY to subtract the ground voltage from
the next measurement.
3. Press Meas
M/µ .
S PARAMETERS ANALOG IN Aux Input
4. Press Scale Ref
.1
23
x1
Marker
11
x1 and observe the VCO tuning trace:
• If the left half of trace = 0 ± 1000 mV and right half of trace = 100 to 200 mV higher
(one to two divisions, see Figure 3-20): no adjustment is necessary.
• If adjustment is necessary, follow these steps:
a. Remove the upper-rear bumpers and top cover, using a torx screwdriver.
b. Adjust the VCO tune (see Figure 3-21) to position the left half of the trace to
0 ±125 mV. The variable capacitor, C85, has a half-turn tuning range if the A12
Reference Board is part number 08753-60209, and seven turns if the part number
is 08753-60357. Be careful not to overtighten and damage the seven-turn
capacitor.
c. Adjust the HBLB (see Figure 3-21) to position the right half of the trace 125 to
175 mV (about 1 to 1.5 divisions) higher than the left half.
• Refer to Chapter 7 , “Source Troubleshooting,” if you cannot perform the adjustment.
Chapter 3
3-45
Adjustments and Correction Constants
High/Low Band Transition Adjustment
Figure 3-20
High/Low Band Transition Adjustment Trace
Figure 3-21
High/Low Band Adjustment Locations
3-46
Chapter 3
Adjustments and Correction Constants
Fractional-N Spur Avoidance and FM Sideband Adjustment
Fractional-N Spur Avoidance and FM Sideband
Adjustment
This adjustment minimizes the spurs caused by the API (analog phase interpolator, on the
fractional-N assembly) circuits. It also improves the sideband characteristics.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Spectrum analyzer
8563E
Power splitter
11667A Option 001
Attenuator 10 dB
8491A Option 010
BNC cable
8120-1840
GPIB cable
10833A/B/C/D
RF cable set
11851B
Non-metallic adjustment tool
8830-0024
TORX screwdriver T-15
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and earth ground wire
9300-0797
Procedure
1. Connect the equipment as shown in Figure 3-22.
2. Make sure the instruments are set to their default GPIB addresses:
network analyzer = 16, spectrum analyzer = 18.
Chapter 3
3-47
Adjustments and Correction Constants
Fractional-N Spur Avoidance and FM Sideband Adjustment
Figure 3-22
Fractional-N Spur Avoidance and FM Sideband Adjustment Setup
3. Set the spectrum analyzer measurement parameters as follows:
Reference Level
0 dBm
Resolution Bandwidth
100 Hz
Center Frequency
676.145105 MHz
Span
2.5 kHz
4. On the network analyzer, press Preset
CW FREQ 676.045105
M/µ .
Avg
IF BW
3000
x1
Sweep Setup
5. Remove the upper-rear corner bumpers and the top cover, using a torx screwdriver.
6. Adjust the 100 kHz (R77) for a null (minimum amplitude) on the spectrum analyzer.
The minimum signal may, or may not, drop down into the noise floor.
3-48
Chapter 3
Adjustments and Correction Constants
Fractional-N Spur Avoidance and FM Sideband Adjustment
Figure 3-23
Location of API and 100 kHz Adjustments
7. On the spectrum analyzer, set the center frequency for 676.051105 MHz.
8. On the analyzer, press Sweep Setup
CW FREQ
676.048105
M/µ .
9. Adjust the API1 (R35) for a null (minimum amplitude) on the spectrum analyzer.
10.On the spectrum analyzer, set the center frequency for 676.007515 MHz.
11.On the analyzer, press Sweep Setup
CW FREQ
676.004515
M/µ .
12.Adjust the API2 (R43) for a null (minimum amplitude) on the spectrum analyzer.
13.On the spectrum analyzer, set the center frequency for 676.003450 MHz.
14.On the analyzer, press Sweep Setup
CW FREQ
676.00045
M/µ .
15.Adjust the API3 (R45) for a null (minimum amplitude) on the spectrum analyzer.
16.On the spectrum analyzer, set the center frequency for 676.003045 MHz.
17.On the analyzer, press Sweep Setup
CW FREQ
676.000045
M/µ .
18.Adjust the API4 (R47) for a null (minimum amplitude) on the spectrum analyzer.
In Case of Difficulty
19.If this adjustment cannot be performed satisfactorily, repeat the entire procedure, or
replace the A13 board assembly.
Chapter 3
3-49
Adjustments and Correction Constants
Source Spur Avoidance Tracking Adjustment
Source Spur Avoidance Tracking Adjustment
This adjustment optimizes tracking between the YO (YIG oscillator) and the cavity
oscillator when they are frequency offset to avoid spurs. Optimizing YO-cavity oscillator
tracking reduces potential phase-locked loop problems.
Analyzer warmup time: 30 minutes.
Required Equipment and Tools
Description
HP/Agilent Part Number
TORX screwdriver T-15
BNC alligator clip adapter
8120-1292
BNC-to-BNC cable
8120-1840
Antistatic wrist strap
9300-1367
Antistatic wrist strap cord
9300-0980
Static-control table mat and ground wire
9300-0797
Procedure
1. Remove the upper-rear corner bumpers and top cover, using a torx screwdriver.
2. Mate the adapter to the BNC cable and connect the BNC connector end to AUX INPUT
on the analyzer’s rear panel. Connect the BNC center conductor alligator-clip to A11
TP10 (labeled φ ERR); the shield clip to A11 TP1 (GND) as shown in Figure 3-24.
Figure 3-24
Location of A11 Test Points and A3 CAV ADJ Adjustments
3. Press Preset
3-50
Center
400
M/µ
Span
50
M/µ .
Chapter 3
Adjustments and Correction Constants
Source Spur Avoidance Tracking Adjustment
4. Press System
SERVICE MENU
ANALOG IN Aux Input
5. Press Format
MORE
11
REAL
ANALOG BUS ON
Meas
S PARAMETERS
x1 .
Scale Ref
10
k/m
MARKER→REFERENCE .
6. To make sure that you have connected the test points properly, adjust the CAV ADJ
potentiometer while observing the analyzer display. You should notice a change in
voltage.
7. Observe the phase locked loop error voltage:
• If “spikes” are not visible on the analyzer display (see Figure 3-25): no adjustment is
necessary.
• If “spikes” are excessive (see Figure 3-25): adjust the CAV ADJ potentiometer (see
Figure 3-24) on the A3 source bias assembly to eliminate the spikes.
• If the “spikes” persist, refer to Chapter 7 , “Source Troubleshooting.”
Figure 3-25
Chapter 3
Display of Acceptable versus Excessive Spikes
3-51
Adjustments and Correction Constants
Unprotected Hardware Option Numbers Correction Constants
Unprotected Hardware Option Numbers Correction
Constants
Analyzer warmup time: None.
This procedure stores the instrument's unprotected option(s) information in A9 CPU
assembly EEPROMs.
1. Make sure the A9 switch is in the Alter position.
2. Record the installed options that are printed on the rear panel of the analyzer.
3. Press System
SERVICE MENU
PEEK/POKE
PEEK/POKE ADDRESS .
4. Refer to Table 3-3 for the address of each unprotected hardware option. Enter the
address for the specific installed hardware option that needs to be enabled or disabled.
Follow the address entry by POKE −1 x1 .
• Pressing POKE
−1
• Pressing POKE
0
x1 after an entry enables the option.
x1 after an entry disables the option.
Table 3-3
PEEK/POKE Addresses
Hardware
Options
PEEK/POKE
Address
1D5
1619001529
011
1619001532
5. Repeat steps 3 and 4 for all of the unprotected options that you want to enable.
6. After you have entered all of the instrument's hardware options, press the following
keys:
System
SERVICE MENU
FIRMWARE REVISION
7. View the analyzer display for the listed options.
8. When you have entered all of the hardware options, return the A9 switch to the Normal
position.
9. Perform the “EEPROM Backup Disk Procedure” on page 3-33.
In Case of Difficulty
If any of the installed options are missing from the list, return to step 2 and re-enter the
missing option(s).
3-52
Chapter 3
Adjustments and Correction Constants
Sequences for Mechanical Adjustments
Sequences for Mechanical Adjustments
The network analyzer has the capability of automating tasks through a sequencing
function. The following adjustment sequences are available from the Agilent Technologies
web site on the World Wide Web.
• Fractional-N Frequency Range Adjustment (FNADJ and FNCHK)
• High/Low Band Transition Adjustment (HBLBADJ)
• Fractional-N Spur Avoidance and FM Sideband Adjustment (APIADJ)
To download these adjustment sequences from the Internet:
Go the Agilent Technologies Website at the following URL:
http://www.agilent.com/
Using the search function, search on the following phrase:
8753 adjustment sequence
How to Load Sequences from Disk
1. Place the sequence disk in the analyzer disk drive.
2. Press Local
SYSTEM CONTROLLER Seq MORE
LOAD SEQ FROM DISK READ SEQ FILE TITLES .
3. Select any or all of the following sequence files by pressing:
• Select LOAD SEQ APIADJ if you want to load the file for the “Fractional-N Spur
Avoidance and FM Sideband Adjustment.”
• Select LOAD SEQ HBLBADJ if you want to load the file for the “High/Low Band
Transition Adjustment.”
• Select LOAD SEQ FNADJ and LOAD SEQ FNCHK if you want to load the files for
the “Fractional-N Frequency Range Adjustment.”
How to Set Up the Fractional-N Frequency Range Adjustment
1. Remove the right-rear bumpers and right side cover. This exposes the adjustment
location in the sheet metal.
2. Press Preset
SEQUENCE X FNADJ (where X is the sequence number).
3. Adjust the “FN VCO TUNE” with a non-metallic tool so that the channel 1 marker is as
many divisions above the reference line as the channel 2 marker is below it.
4. Press Preset
SEQUENCE X FNCHK (where X is the sequence number).
• If the marker value is <7, you have completed this procedure.
• If the marker value is >7, readjust “FN VCO TUNE” to 7. Then repeat steps 2, 3, and
4 to confirm that the channel 1 and channel 2 markers are still above and below the
reference line respectively.
Chapter 3
3-53
Adjustments and Correction Constants
Sequences for Mechanical Adjustments
How to Set Up the High/Low Band Transition Adjustments
1. Press Preset
SEQ X HBLBADJ (where X is the sequence number).
2. Observe the VCO tuning trace:
• If the left half of trace = 0 ± 1000 mV and right half of trace = 100 to 200 mV higher
(one to two divisions): no adjustment is necessary.
• If the adjustment is necessary, follow these steps:
a. Remove the upper-rear bumpers and top cover, using a TORX screwdriver.
b. Adjust the VCO tune (A12 C85) to position the left half of the trace to 0 ±125 mV.
This is a very sensitive adjustment where the trace could easily go off of the
screen.
c. Adjust the HBLB (A12 R68) to position the right half of the trace 125 to 175 mV
(about 1 to 1.5 divisions) higher than the left half.
• Refer to Chapter 7 , “Source Troubleshooting,” if you cannot perform the adjustment.
How to Set Up the Fractional-N Spur Avoidance and FM Sideband
Adjustment
1. Press Preset
SEQUENCE X APIADJ (where X is the sequence number).
2. Remove the upper-rear corner bumpers and the top cover, using a TORX screwdriver.
3. Follow the directions on the analyzer display and make all of the API adjustments.
Sequence Contents
Sequence for the High/Low Band Transition Adjustment
— Sequence HBLBADJ sets the hi-band to low-band switch point. —
PRESET
SYSTEM
SERVICE MENU
ANALOG BUS ON
START 11 M/u
STOP 21 M/u
MEAS
ANALOG IN 22 x1 (A12 GND)
DISPLAY
DATA > MEM
DATA − MEM
MEAS
ANALOG IN 23 x1 (VCO TUNE)
MKR 11 M/u
SCALE/REF .1 x1
3-54
Chapter 3
Adjustments and Correction Constants
Sequences for Mechanical Adjustments
Sequences for the Fractional-N Frequency Range Adjustment
— Sequence FNADJ sets up A14 (FRAC N Digital) VCO. —
DISPLAY
DUAL CHAN ON
SYSTEM
SERVICE MENU
ANALOG BUS ON
SWEEP SETUP
NUMBER OF POINTS 11 x1
COUPLED CHAN OFF
START 36 M/u
STOP 60.75 M/u
SWEEP SETUP
SWEEP TIME 12.5 k/m
MEAS
ANALOG IN 29 x1 (FN VCO TUN)
SCALE/REF 0.6 x1
REF VALUE −7 x1
MKR
CH 2
SWEEP SETUP
CW FREQ 31.0001 M/u
SWEEP TIME 12.375 k/m
MEAS
ANALOG IN 29 x1 (FN VCO TUN)
SCALE/REF .2 x1
REF VALUE 6.77 x1
MKR 6 k/m
— Sequence FNCHK checks the VCO adjustment. —
SWEEP SETUP
CW FREQ 1 G/n
SYSTEM
SERVICE MENU
ANALOG BUS ON
SERVICE MODES
FRAC N TUNE ON
MEAS
ANALOG IN 29 x1
MKR
SCALE/REF
REF VALUE 7 x1
Chapter 3
3-55
Adjustments and Correction Constants
Sequences for Mechanical Adjustments
Sequences for the Fractional-N Avoidance and FM Sideband Adjustment
— Sequence APIADJ sets up the fractional-N API spur adjustments. —
TITLE
SP 2.5K
PERIPHERAL HPIB ADDR
18 x1
TITLE TO PERIPHERAL
WAIT x
0 x1
TITLE
AT 0DB
TITLE TO PERIPHERAL
WAIT x
0 x1
TITLE
RB 100HZ
TITLE TO PERIPHERAL
WAIT x
0 x1
TITLE
CF 676.145105MZ
TITLE TO PERIPHERAL
WAIT x
0 x1
CW FREQ
676.045105M/u
TITLE
ADJ A13 100KHZ
SEQUENCE
PAUSE
TITLE
CF 676.051105MZ
TITLE TO PERIPHERAL
WAIT x
0 x1
CW FREQ
676.048105M/u
TITLE
ADJ A13 API1
SEQUENCE
PAUSE
3-56
Chapter 3
Adjustments and Correction Constants
Sequences for Mechanical Adjustments
TITLE
CF 676.007515MZ
TITLE TO PERIPHERAL
WAIT x
0 x1
CW FREQ
676.004515M/u
TITLE
ADJ A13 API2
SEQUENCE
PAUSE
TITLE
CF 676.003450MZ
TITLE TO PERIPHERAL
WAIT x
0 x1
CW FREQ
676.000450M/u
TITLE
ADJ A13 API3
SEQUENCE
PAUSE
TITLE
CF 676.003045MZ
TITLE TO PERIPHERAL
WAIT x
0 x1
CW FREQ
676.000045M/u
TITLE
ADJ A13 API4
Chapter 3
3-57
Adjustments and Correction Constants
Sequences for Mechanical Adjustments
3-58
Chapter 3
4 Start Troubleshooting Here
4-1
Start Troubleshooting Here
Start Troubleshooting Here
Start Troubleshooting Here
The information in this chapter helps you:
• Identify the portion of the analyzer that is at fault.
• Locate the specific troubleshooting procedures to identify the assembly or peripheral at
fault.
To identify the portion of the analyzer at fault, follow these procedures:
Step 1. Initial Observations on page 4-5
Step 2. Operator's Check on page 4-6
Step 3. GPIB Systems Check on page 4-8
Step 4. Faulty Group Isolation on page 4-10
4-2
Chapter 4
Start Troubleshooting Here
Assembly Replacement Sequence
Assembly Replacement Sequence
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group by following the procedures in this chapter. Follow up with the
appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
Chapter 4
4-3
Start Troubleshooting Here
Having Your Analyzer Serviced
Having Your Analyzer Serviced
If the analyzer should fail any of the following checks, call the nearest Agilent Technologies
sales or service office to determine the warranty on your instrument, and whether repair
will be on-site, or return to Agilent Technologies. If the analyzer needs to be returned to
Agilent Technologies, perform the following steps.
1. Choose the nearest Agilent Technologies service center. (Refer to “Contacting Agilent”
on page 15-3.)
2. Include a detailed description of any failed test and any error message.
3. Ship the analyzer, using the original or comparable antistatic packaging materials.
4-4
Chapter 4
Start Troubleshooting Here
Step 1. Initial Observations
Step 1. Initial Observations
Initiate the Analyzer Self-Test
1. Disconnect all devices and peripherals from the analyzer (including all test set
interconnects).
2. Switch on the analyzer and press Preset .
3. Watch for the indications shown in Figure 4-1 to determine if the analyzer is operating
correctly.
Figure 4-1
Preset Sequence
• If the self-test failed, refer to “Step 4. Faulty Group Isolation” on page 4-10.
Chapter 4
4-5
Start Troubleshooting Here
Step 2. Operator's Check
Step 2. Operator's Check
The operator's check determines that:
• The source is phase locked across the entire frequency range.
• All three samplers are functioning properly.
Analyzer warm-up time: 30 minutes.
Required Equipment
Description
HP/Agilent Model Number
Power splitter
11667A Option 001
Attenuator 20 dB
8491A Option 020
RF cable set
11851B
Procedure
1. Disconnect all devices, peripherals, and accessories (including adapters and limiters)
from the analyzer.
2. Press Preset
System SERVICE MENU TESTS 21
x1 . When “TEST 21 R&A
Op Check” appears on the analyzer display, press EXECUTE TEST .
3. At the prompt, connect the equipment as shown in Figure 4-2, with power to inputs R
and A. Press CONTINUE , as prompted, until the analyzer displays “PASS” or “FAIL.”
Figure 4-2
4-6
Setup for Operator’s Check
Chapter 4
Start Troubleshooting Here
Step 2. Operator's Check
4. Press 22
x1 to access the input R and B operator’s check. When the title appears,
press EXECUTE TEST . Move the RF cable from input A to B. Press CONTINUE , as
prompted, until the analyzer displays “PASS” or “FAIL.”
If the Operator’s Check Failed
• Recheck the equipment configuration and connections; if necessary, retest.
• Confirm that the attenuator, splitter and cables meet their published specifications.
Visually inspect the connectors. Retest or refer to “Step 4. Faulty Group Isolation” on
page 4-10.
Chapter 4
4-7
Start Troubleshooting Here
Step 3. GPIB Systems Check
Step 3. GPIB Systems Check
Check the analyzer's GPIB functions with a known working passive peripheral (such as a
plotter, printer, or disk drive).
1. Connect the peripheral to the analyzer using a good GPIB cable.
2. Press Local
peripheral.
SYSTEM CONTROLLER to enable the analyzer to control the
3. Then press SET ADDRESSES and the appropriate softkeys to verify that the device
addresses will be recognized by the analyzer. The factory default addresses are:
Device
NOTE
GPIB Address
8753ET/ES
16
Plotter port – GPIB
5
Printer port – GPIB
1
Disk (external)
0
Controller
21
Power meter – GPIB
13
You may use other addresses with two provisions:
• Each device must have its own address.
• The address set on each device must match the one recognized by the
analyzer (and displayed).
Peripheral addresses are often set with a rear panel switch. Refer to the
manual of the peripheral to read or change its address.
If Using a Plotter or Printer
1. Ensure that the plotter or printer is set up correctly:
• Power is on.
• Pens and paper loaded.
• Pinch wheels are down.
• Some plotters need to have P1 and P2 positions set.
2. Press Copy and then PLOT or PRINT MONOCHROME .
• If the result is a copy of the analyzer display, the printing/plotting features are
functional in the analyzer. Proceed to “Troubleshooting Systems with Multiple
Peripherals” on page 4-9, “Troubleshooting Systems with Controllers” on page 4-9, or
“Step 4. Faulty Group Isolation” on page 4-10.
4-8
Chapter 4
Start Troubleshooting Here
Step 3. GPIB Systems Check
• If the result is not a copy of the analyzer display, suspect the GPIB function of the
analyzer. Refer to Chapter 6 , “Digital Control Troubleshooting.”
If Using an External Disk Drive
1. Select the external disk drive. Press Save/Recall
SELECT DISK
2. Verify that the address is set correctly. Press Local
ADDRESS:DISK .
EXTERNAL DISK .
SET ADDRESSES
3. Ensure that the disk drive is set up correctly:
• Power is on.
• An initialized disk in the correct drive.
• Correct disk unit number and volume number (press Local to access the softkeys
that display the numbers; default is 0 for both).
• With hard disk (Winchester) drives, make sure the configuration switch is properly
set (see drive manual).
4. Press Start
1
M/µ
RECALL STATE .
Save/Recall
SAVE STATE . Then press Preset
Save/Recall
• If the resultant trace starts at 1 MHz, GPIB is functional in the analyzer. Proceed to
“Troubleshooting Systems with Multiple Peripherals” on page 4-9, “Troubleshooting
Systems with Controllers” on page 4-9, or “Step 4. Faulty Group Isolation” on
page 4-10.
• If the resultant trace does not start at 1 MHz, suspect the GPIB function of the
analyzer: refer to Chapter 6 , “Digital Control Troubleshooting.”
Troubleshooting Systems with Multiple Peripherals
Connect any other system peripherals (but not a controller) to the analyzer one at a time
and check their functionality. Any problems observed are in the peripherals, cables, or are
address problems (see above).
Troubleshooting Systems with Controllers
Passing the preceding checks indicates that the analyzer's peripheral functions are
normal. Therefore, if the analyzer has not been operating properly with an external
controller, check the following:
• The GPIB interface hardware is incorrectly installed or not operational.
• The programming syntax is incorrect. (Refer to your analyzer’s programmer's guide.)
If the analyzer appears to be operating unexpectedly but has not completely failed, go to
“Step 4. Faulty Group Isolation” on page 4-10.
Chapter 4
4-9
Start Troubleshooting Here
Step 4. Faulty Group Isolation
Step 4. Faulty Group Isolation
Use the following procedures only if you have read the previous sections in this chapter
and you think the problem is in the analyzer. These are simple procedures to verify the
four functional groups in sequence, and determine which group is faulty.
The four functional groups are:
• power supplies
• digital control
• source
• receiver
Descriptions of these groups are provided in Chapter 12 , “Theory of Operation.”
The checks in the following pages must be performed in the order presented. If one of the
procedures fails, it is an indication that the problem is in the functional group checked. Go
to the troubleshooting information for the indicated group, to isolate the problem to the
defective assembly.
Figure 4-3 illustrates the troubleshooting organization.
Figure 4-3
4-10
Troubleshooting Organization
Chapter 4
Start Troubleshooting Here
Power Supply
Power Supply
Check the Rear Panel LEDs
Switch on the analyzer. Notice the condition of the two LEDs on the A15 preregulator at
rear of the analyzer. (See Figure 4-4.)
• The upper (red) LED should be off.
• The lower (green) LED should be on.
Figure 4-4
A15 Preregulator LEDs
Check the A8 Post Regulator LEDs
Remove the analyzer's top cover. Switch on the power. Inspect the green LEDs along the
top edge of the A8 post-regulator assembly.
• All green LEDs should be on.
• The fan should be audible.
In case of difficulty, refer to Chapter 5 , “Power Supply Troubleshooting.”
Chapter 4
4-11
Start Troubleshooting Here
Digital Control
Digital Control
Observe the Power Up Sequence
Switch the analyzer power off, then on. The following should take place within a few
seconds:
• On the front panel, observe the following:
1. All six amber LEDs illuminate.
2. The amber LEDs go off after a few seconds, except the CH1 LED. See Figure 4-5.
• The display should come up bright with no irregularity in colors.
• After an initial pattern, five red LEDs on the A9 CPU board should remain off. They can
be observed through a small opening in the rear panel.
If the power up sequence does not occur as described, or if there are problems using the
front panel keyboard, refer to Chapter 6 , “Digital Control Troubleshooting.”
Figure 4-5
4-12
Front Panel Power Up Sequence
Chapter 4
Start Troubleshooting Here
Digital Control
Verify Internal Tests Passed
1. Press Preset
System SERVICE MENU TESTS
EXECUTE TEST . The display should indicate:
INTERNAL TESTS
TEST
0 ALL INT
PASS
• If your display shows the above message, go to step 2. Otherwise, continue with this
step.
• If phase lock error messages are present, this test may stop without passing or
failing. In this case, continue with the next procedure to check the source.
• If you have unexpected results, or if the analyzer indicates a specific test failure, that
internal test (and possibly others) have failed; the analyzer reports the first failure
detected. Refer to Chapter 6 , “Digital Control Troubleshooting.”
• If the analyzer indicates failure but does not identify the test, press
to search
for the failed test. Then refer to Chapter 6 , “Digital Control Troubleshooting.”
Likewise, if the response to front panel or GPIB commands is unexpected,
troubleshoot the digital control group.
2. Perform the Analog Bus test. Press RETURN
19
x1
EXECUTE TEST .
• If this test fails, refer to Chapter 6 , “Digital Control Troubleshooting.”
• If this test passes, continue with the next procedure to check the source.
Chapter 4
4-13
Start Troubleshooting Here
Source
Source
Phase Lock Error Messages
The error messages listed below are usually indicative of a source failure or improper
instrument configuration. (Ensure that the R channel input is receiving at least −35 dBm
power.) Continue with this procedure.
• NO IF FOUND: CHECK R INPUT LEVEL
The first IF was not detected during the pretune stage of phase lock.
• NO PHASE LOCK: CHECK R INPUT LEVEL
The first IF was detected at the pretune stage but phase lock could not be acquired
thereafter.
• PHASE LOCK LOST
Phase lock was acquired but then lost.
• PHASE LOCK CAL FAILED
An internal phase lock calibration routine is automatically executed at power-on, when
pretune values drift, or when phase lock problems are detected. A problem spoiled a
calibration attempt.
• POSSIBLE FALSE LOCK
The analyzer is achieving phase lock but possibly on the wrong harmonic comb tooth.
• SWEEP TIME TOO FAST
The fractional-N and the digital IF circuits have lost synchronization.
Check Source Output Power
1. Connect the equipment as shown in Figure 4-6. Be sure that any special accessories,
such as limiters, have been disconnected.
4-14
Chapter 4
Start Troubleshooting Here
Source
Figure 4-6
Equipment Setup for Source Power Check
2. Zero and calibrate the power meter. Press Preset
instrument.
on the analyzer to initialize the
3. On the analyzer, press Sweep Setup CW FREQ 300 k/m to output a CW 300 kHz
signal. The power meter should read approximately 0 dBm.
4. Press 16
M/µ to change the CW frequency to 16 MHz. The output power should
remain approximately 0 dBm throughout the analyzer frequency range. Repeat this
step at 1 and 3 GHz. (For Option 006 include an additional check at 6 GHz.)
If any incorrect power levels are measured, refer to Chapter 7 , “Source Troubleshooting.”
No Oscilloscope or Power Meter? Try the ABUS
Monitor ABUS node 16 by completing the following steps.
1. Press Preset
Start
ANALOG BUS ON .
2.
Meas
3.
Format
300
S PARAMETERS
MORE
REAL
k/m
Stop
3
G/n
ANALOG IN Aux Input
Scale Ref
System
16
SERVICE MENU
x1
AUTOSCALE .
The display should resemble Figure 4-7.
Chapter 4
4-15
Start Troubleshooting Here
Source
Figure 4-7
ABUS Node 16: 1 V/GHz
If any of the above procedures provide unexpected results, or if error messages are present,
refer to Chapter 7 , “Source Troubleshooting.”
4-16
Chapter 4
Start Troubleshooting Here
Receiver
Receiver
Observe the A and B Input Traces
1. Connect the equipment as shown in Figure 4-8 below. Be sure that any special
accessories, such as limiters, have been disconnected.
Figure 4-8
Equipment Setup
2. Press Preset
Meas R Scale Ref
MARKER→ REFERENCE .
AUTO SCALE
Marker Fctn
3. Observe the measurement trace displayed by the R input. The trace should have about
the same flatness as the trace in Figure 4-9.
NOTE
The R trace will be 20 dB lower than the A and B trace due to the attenuator
on the R input. The flatness of the trace, however, should resemble that of the
A and B traces.
4. Press Meas A to check the A channel trace. The trace should have about the same
flatness as the trace in Figure 4-9.
5. Move the A input cable to the B input and press B to check the B channel trace. The
trace should have about the same flatness as the trace in Figure 4-9.
Chapter 4
4-17
Start Troubleshooting Here
Receiver
Figure 4-9
Typical Measurement Trace
If the source is working, but the R, A, or B input traces appear to be in error, refer to
Chapter 8 , “Receiver Troubleshooting.”
The following symptoms may also indicate receiver failure.
Receiver Error Messages
• CAUTION: OVERLOAD ON INPUT A; POWER REDUCED
• CAUTION: OVERLOAD ON INPUT B; POWER REDUCED
• CAUTION: OVERLOAD ON INPUT R; POWER REDUCED
The error messages above indicate that you have exceeded approximately +14 dBm at one
of the test ports. The RF output power is automatically reduced to −85 dBm. The
annotation P↓ appears in the left margin of the display to indicate that the power trip
function has been activated. When this occurs, press Power and enter a lower power
level. Press SOURCE PWR ON to switch on the power again.
Faulty Data
Any trace data that appears to be below the noise floor of the analyzer (−100 dBm) is
indicative of a receiver failure.
4-18
Chapter 4
Start Troubleshooting Here
Accessories
Accessories
If the analyzer has passed all of the previous checks but is still making incorrect
measurements, suspect the system accessories. Accessories such as RF or interconnect
cables, calibration or verification kit devices, limiters, adapters, and test sets can all induce
system problems.
Reconfigure the system as it is normally used and reconfirm the problem. Continue with
Chapter 9 , “Accessories Troubleshooting.”
Accessories Error Messages
• POWER PROBE SHUT DOWN!
The biasing supplies to a front panel powered device (like a probe or millimeter module)
are shut down due to excessive current draw. Troubleshoot the device.
Chapter 4
4-19
Start Troubleshooting Here
Accessories
4-20
Chapter 4
Start Troubleshooting Here
Accessories
4-22
Chapter 4
5 Power Supply Troubleshooting
5-1
Power Supply Troubleshooting
Power Supply Troubleshooting
Power Supply Troubleshooting
Use this procedure only if you have read Chapter 4 , “Start Troubleshooting Here.” Follow
the procedures in the order given, unless:
• an error message appears on the display; refer to “Error Messages” on page 5-17.
• the fan is not working; refer to “Fan Troubleshooting” on page 5-19.
The power supply group assemblies consist of the following:
• A8 post regulator
• A15 preregulator
All assemblies, however, are related to the power supply group because power is supplied
to each assembly.
5-2
Chapter 5
Power Supply Troubleshooting
Assembly Replacement Sequence
Assembly Replacement Sequence
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
Chapter 5
5-3
Power Supply Troubleshooting
Simplified Block Diagram
Simplified Block Diagram
Figure 5-1 shows the power supply group in simplified block diagram form. Refer to the
detailed block diagram of the power supply located at the end of this chapter to see voltage
lines and specific connector pin numbers.
Figure 5-1
5-4
Power Supply Group Simplified Block Diagram
Chapter 5
Power Supply Troubleshooting
Start Here
Start Here
Check the Green LED and Red LED on A15
Switch on the analyzer and look at the rear panel of the analyzer. Check the two power
supply diagnostic LEDs on the A15 preregulator casting by looking through the holes
located to the left of the line voltage selector switch. (See Figure 5-2.)
During normal operation, the bottom (green) LED is on and the top (red) LED is off. If
these LEDs are normal, then A15 is 95% verified. Continue to “Check the Green LEDs on
A8”.
• If the green LED is not on steadily, refer to “If the Green LED of the A15 Is Not ON
Steadily” on page 5-7.
• If the red LED is on or flashing, refer to “If the Red LED of the A15 Is ON” on page 5-8.
Figure 5-2
Location of A15 Diagnostic LEDs
Check the Green LEDs on A8
Remove the top cover of the analyzer and locate the A8 post regulator; use the location
diagram under the top cover if necessary. Check to see if the green LEDs on the top edge of
A8 are all on. There are nine green LEDs (one is not visible without removing the PC board
stabilizer).
• If all of the green LEDs on the top edge of A8 are on, there is a 95% confidence level that
the power supply is verified. To confirm the last 5% uncertainty of the power supply,
refer to “Measure the Post Regulator Voltages,” next.
• If any LED on the A8 post regulator is off or flashing, refer to “If the Green LEDs of the
A8 Are Not All ON” on page 5-13.
Chapter 5
5-5
Power Supply Troubleshooting
Start Here
Measure the Post Regulator Voltages
Measure the DC voltages on the test points of A8 with a voltmeter. Refer to Figure 5-3 for
test point locations and Table 5-3 for supply voltages and limits.
Figure 5-3
A8 Post Regulator Test Point Locations
Table 5-1. A8 Post Regulator Test Point Voltages
TP
Supply
Range
1
+65 V (not used)
+64.6 to +65.4
2
AGND
n/a
3
+5 VD
+4.9 to +5.3
4
SDIS
n/a
5
−15 V
−14.4 to −15.6
6
−12.6 VPP (probe power)
−12.1 to −12.91
7
+15 V
+14.5 to +15.5
8
+5 VU
+5.05 to +5.35
9
−5.2 V
−5.0 to −5.4
10
+22 V
+21.3 to +22.7
11
+6 V
+5.8 to +6.2
5-6
Chapter 5
Power Supply Troubleshooting
If the Green LED of the A15 Is Not ON Steadily
If the Green LED of the A15 Is Not ON Steadily
If the green LED is not on steadily, the line voltage is not enough to power the analyzer.
Check the Line Voltage, Selector Switch, and Fuse
Check the main power line cord, line fuse, line selector switch setting, and actual line
voltage to see that they are all correct. Figure 5-4 shows how to remove the line fuse, using
a small flat-blade screwdriver to pry out the fuse holder. Figure 5-2 shows the location of
the line voltage selector switch. Use a small flat-blade screwdriver to select the correct
switch position.
NOTE
Refer to “Hardware, Preregulator” on page 13-33 for the correct line fuse
description and part number.
If the A15 green LED is still not on steadily, replace A15.
Figure 5-4
Chapter 5
Removing the Line Fuse
5-7
Power Supply Troubleshooting
If the Red LED of the A15 Is ON
If the Red LED of the A15 Is ON
If the red LED is on or flashing, the power supply is shutting down. Use the following
procedures to determine which assembly is causing the problem.
Check the A8 Post Regulator
1. Switch off the analyzer.
2. Disconnect the cable A15W1 from the A8 post regulator. (See Figure 5-5.)
3. Switch on the analyzer and observe the red LED on A15.
• If the red LED goes out, the problem is probably the A8 post regulator. Continue to
“Verify the A15 Preregulator” on page 5-10 to first verify that the inputs to A8 are
correct.
• If the red LED is still on, fuse F4 in the preregulator A15 may need to be replaced if
the line voltage selector switch was set to 120 V, and the instrument was connected
to a 220 V supply.
• If the red LED is still on, the problem is probably the A15 preregulator, or one of the
assemblies obtaining power from it. Continue with “Check for a Faulty Assembly” on
page 5-11.
5-8
Chapter 5
Power Supply Troubleshooting
If the Red LED of the A15 Is ON
Figure 5-5
Chapter 5
Power Supply Cable Locations
5-9
Power Supply Troubleshooting
If the Red LED of the A15 Is ON
Verify the A15 Preregulator
Verify that the A15 preregulator is supplying the correct voltages to the A8 post regulator.
Use a voltmeter with a small probe to measure the output voltages of A15W1's plug. Refer
to Table 5-2 and Figure 5-6.
• If the voltages are not within tolerance, replace A15.
• If the voltages are within tolerance, A15 is verified. Continue to “Check for a Faulty
Assembly” on page 5-11.
Table 5-2
Output Voltages
Pin
A15W1P1 Voltages
(Disconnected)
A8J2 Voltages
(Connected)
A15 Preregulator
Label
1
N/C
+68 to +76.2
N/C
2
+125 to +100
+68 to +76.2
+70 V
3, 4
+22.4 to +33.6
+17.0 to +18.4
+18 V
5, 6
−22.4 to −33.6
−17.0 to −18.4
−18 V
7
N/C
+7.4 to +8.0
N/C
8
+9.4 to +14
+7.4 to +8.0
+8 V
9, 10
−9.4 to −14
−6.7 to −7.4
−8 V
11
N/C
+24.6 to +28.6
N/C
12
+32 to +48
+24.6 to +28.6
+25 V
NOTE
5-10
The +5 VD supply must be loaded by one or more assemblies at
all times, or the other voltages will not be correct. It connects to
the motherboard connector A17J3 Pin 4.
Chapter 5
Power Supply Troubleshooting
If the Red LED of the A15 Is ON
Figure 5-6
A15W1 Plug Detail
Check for a Faulty Assembly
This procedure checks for a faulty assembly that might be shutting down the A15
preregulator via one of the following lines (also refer to Figure 5-1):
• A15W1 connecting to the A8 post regulator
• the +5VCPU line through the motherboard
• the +5VDIG line through the motherboard
Do the following:
1. Switch off the analyzer.
2. Ensure that A15W1 is reconnected to A8. (Refer to Figure 5-5.)
3. Remove or disconnect the assemblies listed in Table 5-3 one at a time and in the order
shown. The assemblies are sorted from most to least accessible. Table 5-3 also lists any
associated assemblies that are supplied by the assembly that is being removed. After
each assembly is removed or disconnected switch on the analyzer and observe the red
LED on A15.
CAUTION
• Always switch off the analyzer before removing or disconnecting assemblies.
• When extensive disassembly is required, refer to Chapter 14 , “Assembly
Replacement and Post-Repair Procedures.”
• Refer to Chapter 13 , “Replaceable Parts,” to identify specific cables and
assemblies that are not shown in this chapter.
Chapter 5
5-11
Power Supply Troubleshooting
If the Red LED of the A15 Is ON
• If the red LED goes out, the particular assembly (or one receiving power from it) that
allows it to go out is faulty.
• If the red LED is still on after you have checked all of the assemblies listed in Table 5-3,
continue to “Check the Operating Temperature” on page 5-12.
Table 5-3
Recommended Order for Removal/Disconnection
Assembly To Remove
Removal or Disconnection
Method
Other Assemblies that Receive Power
from the Removed Assembly
1. A19 Graphics Processor
Remove from Card Cage
None
Disconnect from W14
A18 Display
2. A14 Frac N Digital
Remove from Card Cage
None
3. A9 CPU
Disconnect W36
A20 Disk Drive
Remove from cardcage
None
4. A16 Rear Panel Interface
Disconnect W27
None
5. A2 Front Panel Interface
Disconnect W17
A1 Front Panel Keyboard A18 Display
Check the Operating Temperature
The temperature sensing circuitry inside the A15 preregulator may be shutting down the
supply. Make sure the temperature of the open air operating environment does not exceed
55 °C (131 °F), and that the analyzer fan is operating.
• If the fan does not seem to be operating correctly, refer to “Fan Troubleshooting” on
page 5-19.
• If there does not appear to be a temperature problem, it is likely that A15 is faulty.
Inspect the Motherboard
If the red LED is still on after replacement or repair of A15, switch off the analyzer and
inspect the motherboard for solder bridges and other noticeable defects. Use an ohmmeter
to check for shorts. The +5 VD, +5 VCPU, or +5 VDSENSE lines may be bad. Refer to the
block diagram at the end of this chapter and troubleshoot these suspected power supply
lines on the A17 motherboard.
5-12
Chapter 5
Power Supply Troubleshooting
If the Green LEDs of the A8 Are Not All ON
If the Green LEDs of the A8 Are Not All ON
The green LEDs along the top edge of the A8 post regulator are normally on.
Flashing LEDs on A8 indicate that the shutdown circuitry on the A8 post regulator is
protecting power supplies from overcurrent conditions by repeatedly shutting them down.
This may be caused by supply loading on A8 or on any other assembly in the analyzer.
Remove A8, Maintain A15W1 Cable Connection
1. Switch off the analyzer.
2. Remove A8 from its motherboard connector, but keep the A15W1 cable connected to A8.
3. Remove the display power cable.
4. Short A8TP2 (AGND) (see Figure 5-3 on page 5-6) to chassis ground with a clip lead.
5. Switch on the analyzer and observe the green LEDs on A8.
• If any green LEDs other than +5 VD are still off or flashing, continue to “Check the
A8 Fuses and Voltages” on page 5-13.
• If all LEDs are now on steadily except for the +5 VD LED, the A15 preregulator and
A8 post regulator are working properly and the trouble is excessive loading
somewhere after the motherboard connections at A8. Continue to “Remove the
Assemblies” on page 5-14.
Check the A8 Fuses and Voltages
Check the fuses along the top edge of A8. If any A8 fuse has burned out, replace it. If it
burns out again when power is applied to the analyzer, A8 or A15 is faulty. Determine
which assembly has failed as follows.
1. Remove the A15W1 cable at A8. (See Figure 5-5 on page 5-9.)
2. Measure the voltages at A15W1P1 (see Figure 5-6 on page 5-11) with a voltmeter
having a small probe.
3. Compare the measured voltages with those in Table 5-2 on page 5-10.
• If the voltages are within tolerance, replace A8.
• If the voltages are not within tolerance, replace A15.
If the green LEDs are now on, the A15 preregulator and A8 post regulator are working
properly and the trouble is excessive loading somewhere after the motherboard
connections at A8. Continue to “Remove the Assemblies,” next.
Chapter 5
5-13
Power Supply Troubleshooting
If the Green LEDs of the A8 Are Not All ON
Remove the Assemblies
1. Switch off the analyzer.
2. Install A8. Remove the jumper from A8TP2 (AGND) to chassis ground.
3. Remove or disconnect all the assemblies listed below. (See Figure 5-5 on page 5-9.)
Always switch off the analyzer before removing or disconnecting an assembly.
A9 CPU
A10 digital IF
A11 phase lock
A12 reference
A13 fractional-N analog
A14 fractional-N digital
A19 graphics processor
4. Switch on the analyzer and observe the green LEDs on A8.
• If any of the green LEDs are off or flashing, it is not likely that any of the assemblies
listed above is causing the problem. Continue to “Briefly Disable the Shutdown
Circuitry” on page 5-15.
• If all green LEDs are now on, one or more of the above assemblies may be faulty.
Continue to the next step.
5. Switch off the analyzer.
6. Reconnect W14 and W20 to A19.
7. Reinstall each assembly one at a time. Switch on the analyzer after each assembly is
installed. The assembly that causes the green LEDs to go off or flash could be faulty.
NOTE
5-14
It is possible, however, that this condition is caused by the A8 post regulator
not supplying enough current. To check this, reinstall the assemblies in a
different order to change the loading. If the same assembly appears to be
faulty, replace that assembly. If a different assembly appears faulty, A8 is
most likely faulty (unless both of the other assemblies are faulty).
Chapter 5
Power Supply Troubleshooting
If the Green LEDs of the A8 Are Not All ON
Briefly Disable the Shutdown Circuitry
In this step, you shutdown the protective circuitry for a short time, and the supplies are
forced on (including shorted supplies) with a 100% duty cycle.
Damage to components or to circuit traces may occur if A8TP4 (SDIS) is
shorted to chassis ground for more than a few seconds while supplies are
shorted.
CAUTION
1. Switch off the analyzer.
2. Connect A8TP4 (SDIS) to chassis ground with a jumper wire.
3. Switch on the analyzer and note the signal mnemonics and test points of any LEDs that
are off. Immediately remove the jumper wire.
4. Refer to the block diagram at the end of this chapter and do the following:
• Note the mnemonics of any additional signals that may connect to any A8 test point
that showed a fault in the previous step.
• Cross-reference all assemblies that use the power supplies whose A8 LEDs went out
when A8TP4 (SDIS) was connected to chassis ground.
• Make a list of these assemblies.
• Delete the following assemblies from your list as they have already been verified
earlier in this section.
A10 digital IF
A11 phase lock
A12 reference
A13 fractional-N analog
A14 fractional-N digital
A19 graphics processor
5. Switch off the analyzer.
6. Of those assemblies that are left on the list, remove or disconnect them from the
analyzer one at a time. Table 5-4 shows the best order in which to remove them, sorting
them from most to least accessible. Table 5-4 also lists any associated assemblies that
are supplied by the assembly that is being removed. After each assembly is removed or
disconnected, switch on the analyzer and observe the LEDs.
CAUTION
• Always switch off the analyzer before removing or disconnecting assemblies.
• When extensive disassembly is required, refer to Chapter 14 , “Assembly
Replacement and Post-Repair Procedures.”
• Refer to Chapter 13 , “Replaceable Parts,” to identify specific cables and
assemblies that are not shown in this chapter.
• If all the LEDs light, the assembly (or one receiving power from it) that allows them to
Chapter 5
5-15
Power Supply Troubleshooting
If the Green LEDs of the A8 Are Not All ON
light is faulty.
• If the LEDs are still not on steadily, continue to “Inspect the Motherboard” on
page 5-16.
Table 5-4
Recommended Order for Removal/Disconnection
Assembly To
Remove
Removal or Disconnection
Method
Other Assemblies that Receive Power
from the Removed Assembly
1. A3 Source
Remove from Card Cage
None
2. A7 Pulse
Generator
Remove from Card Cage
None
3. A4 R Sampler
Remove from Card Cage
None
4. A5 A Sampler
Remove from Card Cage
None
5. A6 B Sampler
Remove from Card Cage
None
6. A9 CPU
Disconnect W35 and W36
A20 Disk Drive
7. A2 Front Panel
Interface
Disconnect W17
A1 Front Panel Keyboard
8. A16 Rear Panel
Interface
Disconnect W27
A25 Test Set Interface
A24 Transfer Switch (8753ES only)
A23 LED Front Panel
Inspect the Motherboard
Inspect the A17 motherboard for solder bridges and shorted traces. In particular, inspect
the traces that carry the supplies whose LEDs faulted when A8TP4 (SDIS) was grounded
earlier.
5-16
Chapter 5
Power Supply Troubleshooting
Error Messages
Error Messages
Three error messages are associated with the power supplies functional group. They are
shown here.
• POWER SUPPLY SHUT DOWN!
One or more supplies on the A8 post regulator assembly is shut down due to one of the
following conditions: overcurrent, overvoltage, or undervoltage. Refer to “If the Red
LED of the A15 Is ON” on page 5-8.
• POWER SUPPLY HOT
The temperature sensors on the A8 post regulator assembly detect an overtemperature
condition. The regulated power supplies on A8 have been shut down.
Check the temperature of the operating environment; it should not be greater than
+55 °C (131 °F). The fan should be operating and there should be at least 15 cm (6 in)
spacing behind and all around the analyzer to allow for proper ventilation.
• PROBE POWER SHUT DOWN!
The front panel RF probe biasing supplies are shut down due to excessive current draw.
These supplies are +15 VPP and −12.6 VPP, both supplied by the A8 post regulator.
+15 VPP is derived from the +15 V supply. −12.6 VPP is derived from the −12.6 V
supply.
Refer to Figure 5-7 and carefully measure the power supply voltages at the front panel
RF probe connectors.
Figure 5-7
Chapter 5
Front Panel Probe Power Connector Voltages
5-17
Power Supply Troubleshooting
Error Messages
• If the correct voltages are present, troubleshoot the probe.
• If the voltages are not present, check the +15 V and −12.6 V green LEDs on A8.
— If the LEDs are on, there is an open between the A8 assembly and the front panel
probe power connectors. Put A8 onto an extender board and measure the voltages at
the following pins:
A8P2 pins 6 and 36
−12.6 volts
A8P2 pins 4 and 34
+15 volts
— If the LEDs are off, continue with “Check the Fuses and Isolate A8.”
Check the Fuses and Isolate A8
Check the fuses associated with each of these supplies near the A8 test points. If these
fuses keep burning out, a short exists. Try isolating A8 by removing it from the
motherboard connector, but keeping the cable A15W1 connected to A8J2. Connect a
jumper wire from A8TP2 to chassis ground. If either the +15 V or −12.6 V fuse blows, or the
associated green LEDs do not light, replace A8.
If the +15 V and −12.6 V green LEDs light, troubleshoot for a short between the
motherboard connector pins XA8P2 pins 6 and 36 (−12.6 V) and the front panel probe
power connectors. Also check between motherboard connector pins XA8P2 pins 4 and 34
(+15 V) and the front panel probe power connectors.
5-18
Chapter 5
Power Supply Troubleshooting
Fan Troubleshooting
Fan Troubleshooting
Fan Speeds
The fan speed varies depending upon temperature. It is normal for the fan to be at high
speed when the analyzer is just switched on, and then change to low speed when the
analyzer is cooled.
Check the Fan Voltages
If the fan is dead, refer to the A8 post regulator block diagram at the end of this chapter.
The fan is driven by the +18 V and −18 V supplies coming from the A15 preregulator.
Neither of these supplies is fused.
The −18 V supply is regulated on A8 in the fan drive block, and remains constant at
approximately −14 volts. It connects to the A17 motherboard via pin 32 of the A8P1
connector.
The +18 V supply is regulated on A8 but changes the voltage to the fan, depending on
airflow and temperature information. Its voltage ranges from approximately −1.0 volts to
+14.7 volts, and connects to the A17 motherboard via pin 31 of the A8P1 connector.
Measure the voltages of these supplies while using an extender board to allow access to the
PC board connector, A8P1.
Short A8TP3 to Ground
If there is no voltage at A8P1 pins 31 and 32, switch off the analyzer. Remove A8 from its
motherboard connector (or extender board) but keep the cable A15W1 connected to A8.
(See Figure 5-5 on page 5-9.) Connect a jumper wire between A8TP3 and chassis ground.
Switch on the analyzer.
• If all the green LEDs on the top edge of A8 light (except +5 VD), replace the fan.
• If other green LEDs on A8 do not light, refer to “If the Green LEDs of the A8 Are Not All
ON” on page 5-13.
Chapter 5
5-19
Power Supply Troubleshooting
Intermittent Problems
Intermittent Problems
Preset states that appear spontaneously (without pressing Preset ) typically signal a
power supply or A9 CPU problem. Since the A9 CPU assembly is the easiest to substitute,
do so. If the problem ceases, replace the A9. If the problem continues, replace the A15
preregulator assembly.
5-20
Chapter 5
Power Supply Troubleshooting
Intermittent Problems
5-22
Chapter 5
6 Digital Control Troubleshooting
6-1
Digital Control Troubleshooting
Digital Control Troubleshooting
Digital Control Troubleshooting
Use this procedure only if you have read Chapter 4 , “Start Troubleshooting Here.”
The digital control group assemblies consist of the following:
• CPU
— A9
• Display
— A2, A18, A19, A27
• Front Panel
— A1, A2
• Digital IF
— A10
• Rear Panel Interface
— A16
Begin with “CPU Troubleshooting (A9)” on page 6-5, then proceed to the assembly that you
suspect has a problem. If you suspect an GPIB interface problem, refer to “GPIB Failures”
on page 6-19.
6-2
Chapter 6
Digital Control Troubleshooting
Digital Control Group Block Diagram
Digital Control Group Block Diagram
Figure 6-1
Chapter 6
Digital Control Group Block Diagram
6-3
Digital Control Troubleshooting
Assembly Replacement Sequence
Assembly Replacement Sequence
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
6-4
Chapter 6
Digital Control Troubleshooting
CPU Troubleshooting (A9)
CPU Troubleshooting (A9)
A9 CC Switch Positions
The A9 CC switch must be in the NORMAL position for these procedures. This is the
position for normal operating conditions. To move the switch to the NORMAL position, do
the following:
1. Remove the power line cord from the analyzer.
2. Set the analyzer on its side.
3. Remove the two corner bumpers from the bottom of the instrument with a T-15 TORX
screwdriver.
4. Loosen the captive screw on the bottom cover's back edge.
5. Slide the cover toward the rear of the instrument.
6. Move the switch to the NORMAL position as shown in Figure 6-2.
7. Replace the bottom cover and power cord.
Figure 6-2
Chapter 6
Switch Positions on the A9 CPU
6-5
Digital Control Troubleshooting
CPU Troubleshooting (A9)
Checking A9 CPU Red LED Patterns
The A9 CPU has five red LEDs that can be viewed through a small opening in the rear
panel of the analyzer. (See Figure 6-3.) Four LEDs are easily viewable. The fifth LED must
be viewed by looking to the left at an angle.
1. Cycle the power while observing five red LEDs
Cycle the power on the analyzer and observe the five red LEDs. After an initial pattern,
the five red LEDs on the A9 CPU board should remain off.
• If the LEDs remained off, then proceed to the assembly that you suspect has a
problem.
• If the LEDs did not remain off, switch off the power and remove the bottom cover for
further troubleshooting.
Figure 6-3
CPU LED Window on Rear Panel
2. Cycle the power while observing all eight red LEDs
With the analyzer positioned bottom up, cycle the power and observe the eight red
LEDs while looking from the front of the instrument.
NOTE
If firmware did not load, a red LED on the CPU board will be flashing. Refer
to “Loading Firmware” on page 3-35.
3. Evaluate results
• If either of the following LED patterns remain, go to “Display Troubleshooting (A2,
A18, A19, A27)” on page 6-7. (✸ = LED is on.)
✸
✸
✸
0
✸
✸
✸
0
✸
✸
✸
0
✸
✸
0
✸
(front of instrument ⇓)
• If any other LED patterns remain, replace the A9 CPU after verifying the power
supply.
6-6
Chapter 6
Digital Control Troubleshooting
Display Troubleshooting (A2, A18, A19, A27)
Display Troubleshooting (A2, A18, A19, A27)
This section contains the following information:
• Evaluating Your Display, on page 6-7
• Troubleshooting a White Display, on page 6-10
• Troubleshooting a Black Display, on page 6-10
• Troubleshooting a Display with Color Problems, on page 6-11
Evaluating Your Display
Switch the analyzer off, and then on. The display should be bright with the annotation
legible and intelligible. There are four criteria against which your display is measured:
• Background Lamp Intensity
• Green, Red or Blue Stuck Pixels
• Dark Stuck Pixels
• Newtons Rings
Evaluate the display as follows:
• If either the A18 LCD, A19 GSP, A9 CPU or A27 backlight inverter assemblies are
replaced, perform a visual inspection of the display.
• If it appears that there is a problem with the display, refer to the troubleshooting
information that follows.
• If the new display appears dim or doesn't light, see “Backlight Intensity Check,” next.
Backlight Intensity Check
Required Equipment and Tools
Description
HP/Agilent Part or Model Number
Photometer
Tektronix J16
Probe
Tektronix J6503
Light Occluder
Tektronix 016-0305-00
Antistatic Wrist Strap Cord
9300-0980
Antistatic Wrist Strap
9300-1367
Static-control Table Mat and Ground Wire
9300-0797
Analyzer warm-up time: 30 minutes.
Photometer warm-up time: 30 minutes.
Chapter 6
6-7
Digital Control Troubleshooting
Display Troubleshooting (A2, A18, A19, A27)
NOTE
This procedure should be performed with a photometer and only by qualified
personnel.
1. Press Display MORE ADJUST DISPLAY INTENSITY
display intensity at 100%.
2. Press System SERVICE MENU TESTS 62
to set a white screen test pattern on the display.
x1
100
x1 to set the
EXECUTE TEST
CONTINUE
3. Set the photometer probe to NORMAL. Turn on power to the photometer and allow
30 minutes of warm-up time. Zero the photometer according to the manufacturer's
instructions.
4. Center the photometer on the analyzer display as shown in Figure 6-4.
Figure 6-4
NOTE
Backlight Intensity Check Setup
The intensity levels are read with a display bezel installed.
5. If the photometer registers less than 50 Nits, the display backlight lamp is bad. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures,” for information on
display lamp replacement.
6-8
Chapter 6
Digital Control Troubleshooting
Display Troubleshooting (A2, A18, A19, A27)
Red, Green, or Blue Pixels Specifications
Red, green, or blue “stuck on” pixels may appear against a black background. To test for
these dots, press System SERVICE MENU TESTS 70 x1 EXECUTE TEST
CONTINUE .
In a properly working display, the following will not occur:
— complete rows or columns of stuck pixels
— more than 5 stuck pixels (not to exceed a maximum of 2 red or blue, and 3 green)
— 2 or more consecutive stuck pixels
— stuck pixels less than 6.5 mm apart
Dark Pixels Specifications
Dark “stuck on” pixels may appear against a white background. To test for these dots,
press System SERVICE MENU TESTS 66 x1 EXECUTE TEST CONTINUE .
In a properly working display, the following will not occur:
— more than 12 stuck pixels (not to exceed a maximum of 7 red, green, or blue)
— more than one occurrence of 2 consecutive stuck pixels
— stuck pixels less than 6.5 mm apart
Newton's Rings
To check for the patterns known as Newton's Rings, change the display to white by
pressing the following keys:
Press System
SERVICE MENU
TESTS
66
x1
EXECUTE TEST
CONTINUE .
Figure 6-5 illustrates acceptable and non-acceptable examples of Newtons Rings.
Chapter 6
6-9
Digital Control Troubleshooting
Display Troubleshooting (A2, A18, A19, A27)
Figure 6-5
Newtons Rings
Troubleshooting a White Display
If the display is white, the A27 back light inverter is functioning properly. Connect a VGA
monitor to the analyzer.
• If the image on the external monitor is normal, then suspect A2, A18, or the front panel
cabling.
• If the image on the external monitor is bad, suspect the A19 GSP or cable W20 (CPU to
motherboard).
Troubleshooting a Black Display
1. Remove the front panel with the exception of leaving cable W17 (A2 to motherboard)
connected.
2. Press Preset
while checking to see if there is a flash of light.
• If the light does not flash, suspect the front panel cabling, the display lamp, or the
A27 inverter.
6-10
Chapter 6
Digital Control Troubleshooting
Display Troubleshooting (A2, A18, A19, A27)
Troubleshooting a Display with Color Problems
1. Press Display ADJUST DISPLAY DEFAULT COLORS . If this does not correct the
color problems, continue with the next step.
2. Run display service test 74 as described in “Test Patterns” on page 10-14. Confirm that
there are four intensities for each color.
• If the test passes, then continue.
• If the test fails, then suspect the front panel cabling, A2, A19, or A18.
3. Connect a VGA monitor to the analyzer.
• If the image on the external monitor has the same color problems, then replace the
A19 GSP.
• If the image on the external monitor is acceptable, then there must be a missing
color bit. Suspect the front panel cabling, A2, A19, or A18.
Chapter 6
6-11
Digital Control Troubleshooting
Front Panel Troubleshooting (A1, A2)
Front Panel Troubleshooting (A1, A2)
Check Front Panel LEDs After Preset
1. Press Preset
on the analyzer.
2. Observe that all front panel LEDs turn on and, within five seconds after releasing
Preset , all but the Chan1 and Port 1 LED turns off. Refer to Figure 6-6.
• If all the front panel LEDs either stay on or off, there is a control problem between
A9 and A1/A2. See “Inspect Cables” on page 6-15.
• If, at the end of the turn on sequence, the Chan 1 LED is not on and all GPIB status
LEDs are not off, continue with “Identify the Stuck Key” on page 6-13.
• If you suspect that one or more LEDs have burned out, replace the A1 keypad
assembly.
NOTE
Figure 6-6
6-12
Port 1 and Port 2 LED problems may be caused by the malfunction of the A23
LED board or the A24 transfer switch.
Preset Sequence
Chapter 6
Digital Control Troubleshooting
Front Panel Troubleshooting (A1, A2)
Identify the Stuck Key
Match the front panel LED pattern with the patterns in Table 6-1. The LED pattern
identifies the stuck key. Free the stuck key or replace the front panel part causing the
problem. (The Chan 3 and Chan 4 LEDs are not used. ✸ = LED is on. The foots witch is an
accessory that can be set up through a rear panel port.)
Table 6-1
Front Panel Key Codes
Decimal
Number
LED Pattern
Chan 1
Chan 2
R
L
Key
T
S
0
G/n
✸
1
2
✸
3
✸
4
✸
5
✸
6
✸
✸
7
✸
✸
M/µ
✸
6
k/m
✸
8
✸
9
✸
10
✸
✸
11
✸
✸
12
✸
✸
13
✸
✸
14
✸
✸
✸
15
✸
✸
✸
3
x1
✸
−
8
✸
7
5
✸
4
2
✸
16
✸
17
✸
18
✸
✸
19
✸
✸
20
✸
✸
21
✸
✸
Chapter 6
9
1
.
✸
0
Footswitch
✸
←
✸
Local
System
✸
Seq
6-13
Digital Control Troubleshooting
Front Panel Troubleshooting (A1, A2)
Table 6-1
Front Panel Key Codes
Decimal
Number
LED Pattern
Chan 1
R
L
T
22
✸
✸
✸
23
✸
✸
✸
24
✸
✸
25
✸
✸
26
✸
✸
✸
27
✸
✸
✸
28
✸
✸
✸
29
✸
✸
✸
30
✸
✸
✸
31
S
Save/Recall
✸
Copy
✸
Entry Off
Scale Ref
✸
Cal
Marker Fctn
✸
✸
Power
Sweep Setup
Not Used
32
✸
33
✸
34
✸
✸
35
✸
✸
36
✸
✸
37
✸
✸
38
✸
✸
39
6-14
Chan 2
Key
Chan 2
✸
Chan 4
Format
✸
Avg
Marker Search
✸
✸
Stop
Span
Not Used
40
✸
✸
41
✸
✸
42
✸
✸
✸
43
✸
✸
✸
44
✸
✸
✸
45
✸
✸
✸
46
✸
✸
✸
✸
47
✸
✸
✸
✸
Chan 1
✸
Chan 3
Meas
✸
Display
Marker
✸
Start
Center
✸
Return
Chapter 6
Digital Control Troubleshooting
Front Panel Troubleshooting (A1, A2)
Table 6-1
Front Panel Key Codes
Decimal
Number
LED Pattern
R
L
Key
Chan 1
Chan 2
T
48
✸
✸
49
✸
✸
50
✸
✸
✸
51
✸
✸
✸
52
✸
✸
✸
53
✸
✸
✸
54
✸
✸
✸
✸
55
✸
✸
✸
✸
S
softkey 1
✸
softkey 2
softkey 3
✸
softkey 4
softkey 5
✸
softkey 6
softkey 7
✸
softkey 8
Inspect Cables
Remove the front panel assembly and visually inspect the ribbon cable that connects the
front panel to the motherboard. Also, inspect the interconnecting ribbon cable between A1
and A2. Make sure the cables are properly connected. Replace any bad cables.
Test Using a Controller
If a controller is available, write a simple command to the analyzer. If the analyzer
successfully executes the command, the problem is either the A2 front panel interface or
W17 (A2 to motherboard ribbon cable) is faulty.
Chapter 6
6-15
Digital Control Troubleshooting
Run the Internal Diagnostic Tests
Run the Internal Diagnostic Tests
The analyzer incorporates 20 internal diagnostic tests. Most tests can be run as part of one
or both major test sequences: all internal (test 0) and preset (test 1).
1. Press System
INT tests.
SERVICE MENU
TESTS
0
x1
EXECUTE TEST to perform all
2. Then press 1
x1 to see the results of the preset test. If either sequence fails, press
the
keys to find the first occurrence of a FAIL message for tests 2 through
20. See Table 6-2 for further troubleshooting information.
6-16
Chapter 6
Digital Control Troubleshooting
Run the Internal Diagnostic Tests
Table 6-2
Internal Diagnostic Test with Commentary
Test
Sequencea
Probable Failed Assembliesb: Comments and Troubleshooting Hints
0 All Int
—-
— : Executes tests 3-11, 13-16, 20.
1 Preset
—-
— : Executes tests 2-11, 14-16. Runs at power-on or preset.
2 ROM
P,AI
A9: Repeats on fail; refer to “CPU Troubleshooting (A9)” on page 6-5
to replace ROM or A9.
3 CMOS RAM
P,AI
A9: Replace A9.
4 Main DRAM
P,AI
A9: Repeats on fail; replace A9.
5 DSP Wr/Rd
P,AI
A9: Replace A9.
6 DSP RAM
P,AI
A9: Replace A9.
7 DSP ALU
P,AI
A9: Replace A9.
8 DSP Intrpt
P,AI
A9/A10: Remove A10, rerun test. If fail, replace A9. If pass, replace A10.
9 DIF Control
P,AI
A9/A10: Most likely A9 assembly.
10 DIF
Counter
P,AI
A10/A9/A12: Check analog bus node 17 for 1 MHz. If correct, A12 is
verified; suspect A10.
11 DSP
Control
P,AI
A10/A9: Most likely A10.
12 Fr Pan
Wr/Rd
—-
A2/A1/A9: Run test 23. If fail, replace A2. If pass, problem is on bus
between A9 and A2 or on A9 assembly.
13 Rear Panel
AI
A16/A9: Disconnect A16, and check A9J2 pin 48 for 4 MHz clock signal.
If OK, replace A16. If not, replace A9.
14 Post-reg
P,AI
A15/A8/Destination assembly: See Chapter 5 , “Power Supply
Troubleshooting.”
15 Frac-N
Cont
P,AI
A14: Replace A14.
16 Sweep Trig
P,AI
A14,A10: Most likely A14.
17 ADC Lin
—-
A10: Replace A10.
18 ADC Ofs
—-
A10: Replace A10.
19 ABUS Test
—-
A10: Replace A10.
20 FN Count
AI
A14/A13/A10: Most likely A14 or A13, as previous tests check A10. See
Chapter 7 , “Source Troubleshooting.”
a. P = Part of “Preset” sequence; AI = part of “All Internal” sequence
b. In decreasing order of probability.
Chapter 6
6-17
Digital Control Troubleshooting
If the Fault Is Intermittent
If the Fault Is Intermittent
Repeat Test Function
If the failure is intermittent, do the following:
1. Press System SERVICE MENU TEST OPTIONS REPEAT ON to turn on the
repeat function.
2. Then press RETURN TESTS .
3. Select the test desired and press EXECUTE TEST .
4. Press any key to stop the function. The test repeat function is explained in Chapter 10 ,
“Service Key Menus and Error Messages.”
6-18
Chapter 6
Digital Control Troubleshooting
GPIB Failures
GPIB Failures
If you have performed “Step 3. GPIB Systems Check” on page 4-8, and you suspect there is
an GPIB problem in the analyzer, perform the following test. It checks the internal
communication path between the A9 CPU and the A16 rear panel. It does not check the
GPIB paths external to the instrument.
Press System
SERVICE MENU
TESTS
13
x1
EXECUTE TEST .
• If the analyzer fails the test, the problem is likely to be the A16 rear panel.
• If the analyzer passes the test, it indicates that the A9 CPU can communicate with the
A16 rear panel with a 50% confidence level. There is a good chance that the A16 rear
panel is working. This is because internal bus lines have been tested between the A9
CPU and A16, and GPIB signal paths are not checked external to the analyzer.
Chapter 6
6-19
Digital Control Troubleshooting
GPIB Failures
6-20
Chapter 6
7 Source Troubleshooting
7-1
Source Troubleshooting
Source Troubleshooting
Source Troubleshooting
Use this procedure only if you have read Chapter 4 , “Start Troubleshooting Here.” This
chapter is divided into two troubleshooting procedures for the following problems:
• Incorrect power levels: Perform the “Power” troubleshooting checks on page 7-5.
• Phase lock error: Perform the “Phase Lock Error” troubleshooting checks on page 7-6.
The source group assemblies consist of the following:
• A3 source
• A4 sampler/mixer
• A7 pulse generator
• A11 phase lock
• A12 reference
• A13 fractional-N (analog)
• A14 fractional-N (digital)
7-2
Chapter 7
Source Troubleshooting
Assembly Replacement Sequence
Assembly Replacement Sequence
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
Chapter 7
7-3
Source Troubleshooting
Before You Start Troubleshooting
Before You Start Troubleshooting
Make sure all of the assemblies are firmly seated. Also make sure that input R has a signal
of at least −35 dBm (about 0.01 Vp-p into 50 ohms) at all times to maintain phase lock.
7-4
Chapter 7
Source Troubleshooting
Power
Power
If the analyzer output power levels are incorrect but no phase lock error is present,
perform the following checks in the order given.
For the following checks, make sure that the A9 switch is in the Alter position.
1. Source Default Correction Constants (Test 44)
To run this test, press Preset
System SERVICE MENU TESTS 44
x1
EXECUTE TEST . When complete, DONE should appear on the analyzer display. Use a
power meter to verify that source power can be controlled and that the power level is
approximately correct. If the source passes these checks, proceed with step 2. However, if
FAIL appears on the analyzer display, or if the analyzer fails the checks, replace the source.
2. RF Output Power Correction Constants (Test 47)
Follow the instructions for this procedure given in “RF Output Power Correction Constants
(Test 47)” on page 3-11. The procedure is complete when DONE appears on the analyzer
display. Use a power meter to verify that power levels are now correct. If power levels are
not correct, or if the analyzer fails the routine, proceed with step 3, next.
3. Sampler Magnitude and Phase Correction Constants (Test 53)
Follow the instructions for this procedure given in “Sampler Magnitude and Phase
Correction Constants (Test 53)” on page 3-19. The procedure is complete when DONE
appears on the analyzer display. Next, repeat step 2, above. If the analyzer fails the routine
in step 2, replace the source.
If the analyzer fails the routine in step 3, replace the source.
Chapter 7
7-5
Source Troubleshooting
Phase Lock Error
Phase Lock Error
Figure 7-1
Basic Phase Lock Error Troubleshooting Equipment Setup
Troubleshooting tools include the assembly location diagram and phase lock diagnostic
tools. The assembly location diagram is on the underside of the instrument top cover. The
diagram shows major assembly locations and RF cable connections. The phase lock
diagnostic tools are explained in the “Source Group Troubleshooting Appendix” on
page 7-30 and should be used to troubleshoot phase lock problems. The equipment setup
shown in Figure 7-1 can be used throughout this chapter.
Phase Lock Loop Error Message Check
Phase lock error messages may appear as a result of incorrect pretune correction
constants. To check this possibility, perform the pretune correction constants routine.
The four phase lock error messages, listed below, are described in the “Source Group
Troubleshooting Appendix” on page 7-30.
• NO IF FOUND: CHECK R INPUT LEVEL
• NO PHASE LOCK: CHECK R INPUT LEVEL
• PHASE LOCK CAL FAILED
• PHASE LOCK LOST
1. Connect the power splitter, RF cable and attenuator to inputs A and R as shown in
Figure 7-1.
7-6
Chapter 7
Source Troubleshooting
Phase Lock Error
2. Make sure the A9 CC switch is in the ALTER position:
a. Remove the power line cord from the analyzer.
b. Set the analyzer on its side.
c. Remove the two corner bumpers from the bottom of the instrument with a T-15
TORX screwdriver.
d. Loosen the captive screw on the bottom cover's back edge.
e. Slide the cover toward the rear of the instrument.
f. Set the switch to the ALTER position as shown in Figure 7-2.
g. Replace the bottom cover, corner bumpers, and power cord.
Figure 7-2
Switch Positions on the A9 CPU
3. Switch on the analyzer and press System SERVICE MENU TESTS 46
x1
EXECUTE TEST to generate new analog bus correction constants. Then press
System SERVICE MENU TESTS 45
x1 EXECUTE TEST to generate default
pretune correction constants.
Press System SERVICE MENU TESTS 48
generate new pretune correction constants.
4. Press Preset
x1
EXECUTE TEST
YES to
and observe the analyzer display:
• No error message: set the A9 CC switch to the NORMAL position. Then refer to
“Post-Repair Procedures” on page 14-43 to verify operation.
• Error message visible: continue with “A4 Sampler/Mixer Check,” next.
Chapter 7
7-7
Source Troubleshooting
Phase Lock Error
A4 Sampler/Mixer Check
The A4, A5, and A6 (R, A and B) sampler/mixers are similar in operation. Any sampler can
be used to phase lock the source. To eliminate the possibility of a faulty R sampler, follow
this procedure.
1. Connect the power splitter, RF cable and attenuator to inputs A (or B) and R as shown
in Figure 7-1.
2. Remove the W8 cable (A11J1 to A4) from the R-channel sampler (A4) and connect it to
either the A-channel sampler (A5) or the B-channel sampler (A6), depending on which
one you selected in step 1. Refer to Figure 7-3.
Figure 7-3
Sampler/Mixer to Phase Lock Cable Connection Diagram
3. Remove the W8 cable (A11J1 to A4) from the R-channel sampler (A4) and connect it to
either the A-channel sampler (A5) or the B-channel sampler (A6). Refer to Figure 7-3.
4. If you connected W8 to:
• A5, press Meas
A/R
• A6, press Meas
B/R
5. Ignore the displayed trace, but check for phase lock error messages. If the phase lock
problem persists, the R-channel sampler is not the problem.
A3 Source and A11 Phase Lock Check
This procedure checks the source and part of the phase lock assembly. It opens the
phase-locked loop and exercises the source by varying the source output frequency with the
A11 pretune DAC.
7-8
Chapter 7
Source Troubleshooting
Phase Lock Error
NOTE
If the analyzer failed internal test 48, default pretune correction constants
were stored which may result in a constant offset of several MHz. Regardless,
continue with this procedure.
NOTE
Use a spectrum analyzer for problems above 100 MHz.
1. Connect the oscilloscope or spectrum analyzer as shown in Figure 7-1. (Set the
oscilloscope input impedance to 50 ohms.)
2. Press Preset
System SERVICE MENU SERVICE MODES SRC ADJUST MENU
SRC TUNE ON SRC TUNE FREQ to activate the source tune (SRC TUNE) service
mode.
3. Use the front panel knob or front panel keys to set the pretune frequency to 300 kHz,
30 MHz, and 40 MHz. Verify the signal frequency on the oscilloscope.
NOTE
In SRC TUNE mode, the source output frequency changes in 1 to 2 MHz
increments and should be 1 to 6 MHz above the indicated output frequency.
4. Check for the frequencies indicated by Table 7-1.
Table 7-1
Output Frequency in SRC Tune Mode
Setting
Observed Frequency
300 kHz
1.3 to 6.3 MHz
30 MHz
31 to 36 MHz
40 MHz
41 to 46 MHz
5. The signal observed on an oscilloscope should be as solid as the signal in Figure 7-4.
Figure 7-4
Chapter 7
Waveform Integrity in SRC Tune Mode
7-9
Source Troubleshooting
Phase Lock Error
6. The signal observed on the spectrum analyzer will appear jittery as in Figure 7-5 (B),
not solid as in Figure 7-5 (A). This is because in SRC TUNE mode the output is not
phase locked.
Figure 7-5
Phase Locked Output Compared to Open Loop Output in SRC Tune
Mode
7. Press Power to vary the power and check for corresponding level changes on the test
instrument. (A power change of 20 dB will change the voltage observed on the
oscilloscope by a factor of ten.)
8. Note the results of the frequency and power changes:
• If the frequency and power output changes are correct, skip ahead to “A12 Reference
Check” on page 7-12.
• If the frequency changes are not correct, continue with “YO Coil Drive Check with
Analog Bus” on page 7-11.
• If the power output changes are not correct, check analog bus node 3 by performing
the following steps:
a. Press System
SERVICE MENU
S PARAMETERS
7-10
ANALOG BUS ON
ANALOG IN Aux Input
Format
Meas
MORE
REAL
3
b. Press Marker
2
G/n . The marker should read approximately 434 mU.
c. Press Marker
4
G/n . The marker should read approximately 646 mU.
x1 .
Chapter 7
Source Troubleshooting
Phase Lock Error
YO Coil Drive Check with Analog Bus
NOTE
If the analog bus is not functional, perform the “YO Coil Drive Check with
Oscilloscope” on page 7-11.
1. Press Preset
System
SOURCE PLL OFF
ANALOG BUS .
SERVICE MENU
Meas
ANALOG BUS ON
S PARAMETERS
SERVICE MODES
ANALOG IN Aux Input
AUTOSCALE . This keystroke
2. Press 16
x1
Format MORE REAL Scale Ref
sequence lets you check the pretune DAC and the A11 output to the YO coil drive by
monitoring the 1 V/GHz signal at analog bus node 16.
3. Compare the waveform to Figure 7-6. If the waveform is incorrect, the A11 phase lock
assembly is faulty.
Figure 7-6
1 V/GHz at Analog Bus Node 16 with Source PLL Off.
YO Coil Drive Check with Oscilloscope
NOTE
Use the large extender board for easy access to the voltage points. The
extender board is included with the 8753 Tool Kit. See Chapter 13 ,
“Replaceable Parts,” for part numbers and ordering information.
1. Connect oscilloscope probes to A11P1-1 and A11P1-2. The YO coil drive signal is
actually two signals whose voltage difference drives the coil.
2. Press Preset
System SERVICE MENU SERVICE MODES SOURCE PLL OFF to
operate the analyzer in a swept open loop mode.
Chapter 7
7-11
Source Troubleshooting
Phase Lock Error
3. Monitor the two YO coil drive lines. In source tune mode, the voltage difference should
vary from approximately 3.5 to 5.0 volts as shown in Figure 7-7.
• If the voltages are not correct, replace the faulty A11 assembly.
• If the output signals from the A11 assembly are correct, replace the faulty A3 source
assembly.
• If neither the A11, nor the A3 assembly is faulty, continue with the next check.
Figure 7-7
YO− and YO+ Coil Drive Voltage Differences with SOURCE PLL OFF
A12 Reference Check
The signals are evaluated with pass/fail checks. The most efficient way to check the A12
frequency reference signals is to use the analog bus while referring to Table 7-2.
Alternatively, you can use an oscilloscope, while referring to Table 7-3 and Figure 7-8
through Figure 7-14. If any of the observed signals differs from the figures, there is a 90%
probability that the A12 assembly is faulty. Either consider the A12 assembly defective or
perform the “A12 Digital Control Signals Check” on page 7-18.
Both of these procedures are described ahead.
Analog Bus Method
1. Press Preset
System SERVICE MENU ANALOG BUS ON
S PARAMETERS S PARAMETERS ANALOG IN Aux Input
Meas
ANALOG BUS to
switch on the analog bus and its counter.
2. Press 21
x1 to count the frequency of the 100 kHz signal.
3. Press Sweep Setup CW FREQ 500 k/m . Verify that the counter reading
(displayed on the analyzer next to cnt:) matches the corresponding 100 kHz value for
the CW frequency. (Refer to Table 7-2.)
7-12
Chapter 7
Source Troubleshooting
Phase Lock Error
4. Verify the remaining CW frequencies, comparing the counter reading with the value in
Table 7-2:
• Press 2
• Press 50
Table 7-2
M/µ .
M/µ .
Analog Bus Check of Reference Frequencies
CW Frequency
Analog Bus Node 21
100 kHz
Analog Bus Node 24
2nd LO
Analog Bus Node 25
PLREF
500 kHz
0.100 MHz
0.504 MHz
0.500 MHz
2 MHz
0.100 MHz
2.007 MHz
2.000 MHz
50 MHz
0.100 MHz
0.996 MHz
1.000 MHz
NOTE: The counter should indicate the frequencies listed in this table to within ±0.1%.
Accuracy may vary with gate time and signal strength.
5. Press 24
x1 to count the frequency of the 2nd LO signal.
6. Press Sweep Setup CW FREQ 500 k/m . Verify that the counter reading matches
the corresponding 2nd LO value for the CW frequency. (Refer to Table 7-2.)
7. Verify the remaining CW frequencies, comparing the counter reading with the value in
Table 7-2:
• Press 2
• Press 50
8. Press 25
M/µ .
M/µ .
x1 to count the frequency of the PLREF signal.
9. Press Sweep Setup CW FREQ 500
k/m . Verify that the counter reading matches
the corresponding PLREF value for the CW frequency. (Refer to Table 7-2.)
10.Verify the remaining CW frequencies, comparing the counter reading with the value in
Table 7-2:
• Press 2
• Press 50
M/µ .
M/µ .
11.Check the results.
• If all the counter readings match the frequencies listed in Table 7-2, skip ahead to
“A13/A14 Fractional-N Check” on page 7-20.
• If the counter readings are incorrect at the 500 kHz and 2 MHz settings only, go to
“FN LO at A12 Check” on page 7-16.
• If all the counter readings are incorrect at all three CW frequencies, the counter may
be faulty. Perform the “Oscilloscope Method” check of the signals described next. (If
the signals are good, either the A10 or A14 assemblies could be faulty.)
Chapter 7
7-13
Source Troubleshooting
Phase Lock Error
Oscilloscope Method
You need not use the oscilloscope method unless the analog bus is non-functional or any of
the signals fail the specifications listed in Table 7-2.
If the analog bus is non-functional or the previous check has revealed questionable signals,
observe the signals with an oscilloscope. Table 7-3 identifies a convenient test point and a
plot for the five signals listed.
Table 7-3
A12 Reference Frequencies
Mnemonic
Signal Description
Location
See Figure
Analyzer
Setting
FN100kHzREF
100 kHz Reference
A13TP5
Figure 7-8
any
REF
Phase Lock Reference
A11TP9
Figure 7-9
≥16 MHz CW
REF
Phase Lock Reference
A11TP9
Figure 7-10
5 MHz CW
FN LOa*
Fractional-N LO
A14J2
Figure 7-11
10 MHz CW
4MHz REF
4 MHz Reference
A12TP9
Figure 7-12
any
2ND LO+/−
Second LO
A12P1-2,4
Figure 7-13
≥16 MHz CW
2ND LO+/−
Second LO
A12P1-2,4
Figure 7-14
14 MHz CW
a. Not an A12 signal, but required for A12 lowband operation.
100 kHz Pulses
The 100 kHz pulses are very narrow and typically 1.5 V in amplitude. You may have to
increase the oscilloscope intensity to see these pulses. (See Figure 7-8.)
Figure 7-8
7-14
Sharp 100 kHz Pulses at A13TP5 (any frequency)
Chapter 7
Source Troubleshooting
Phase Lock Error
PLREF Waveforms
REF Signal At A11TP9 REF is the buffered PLREF+ signal. The 1st IF is phase locked
to this signal. Use an oscilloscope to observe the signal at the frequencies noted in Figure
7-9 and Figure 7-10.
High Band REF Signal In high band the REF signal is a constant 1 MHz square wave
as indicated by Figure 7-9.
Figure 7-9
High Band REF Signal (≥16 MHz CW)
Low Band REF Signal In low band this signal follows the frequency of the RF output
signal. Figure 7-10 illustrates a 5 MHz CW signal.
Figure 7-10
REF Signal at A11TP9 (5 MHz CW)
• If REF looks good, skip ahead to “4 MHz Reference Signal” on page 7-16.
• If REF is bad in low band, continue with “FN LO at A12 Check,” next.
Chapter 7
7-15
Source Troubleshooting
Phase Lock Error
FN LO at A12 Check
1. Use an oscilloscope to observe the FN LO from A14 at the cable end of A14J2. Press
Preset
System SERVICE MENU SERVICE MODES FRACN TUNE ON to
switch on the fractional-N service mode.
2. Use the front panel knob to vary the frequency from 30 to 60 MHz. The signal should
appear similar to Figure 7-11. The display will indicate 10 to 60.8 MHz.
• If the FN LO signal is good, the A12 assembly is faulty.
• If the FN LO signal is not good, skip ahead to “A13/A14 Fractional-N Check” on
page 7-20.
Figure 7-11
Typical FN LO Waveform at A12J1
4 MHz Reference Signal
This reference signal is used to control the receiver. If faulty, this signal can cause
apparent source problems because the CPU uses receiver data to control the source. At
A12TP9 it should appear similar to Figure 7-12.
Figure 7-12
7-16
4 MHz Reference Signal at A12TP9 (Preset)
Chapter 7
Source Troubleshooting
Phase Lock Error
2ND LO Waveforms
The 2nd LO signals appear different in phase and shape at different frequencies.
90 Degree Phase Offset of 2nd LO Signals in High Band In high band, the 2nd LO
is 996 kHz. As indicated by Figure 7-13, the 2nd LO actually consists of two signals
90 degrees out of phase.
Figure 7-13
90 Degree Phase Offset of High Band 2nd LO Signals (≥16 MHz CW)
In-Phase 2nd LO Signals in Low Band The 2nd LO signals in low band, as shown in
Figure 7-14, are not phase shifted. In low band these signals track the RF output with a
4 kHz offset.
Figure 7-14
In-Phase Low Band 2nd LO Signals (14 MHz CW)
If any of the signals of Table 7-2 are incorrect, the probability is 90% that the A12
assembly is faulty. Either consider the A12 assembly faulty or perform the “A12 Digital
Control Signals Check,” described next.
Chapter 7
7-17
Source Troubleshooting
Phase Lock Error
A12 Digital Control Signals Check
Several digital control signals must be functional for the A12 assembly to operate properly.
Check the control lines listed in Table 7-1 with the oscilloscope in the high input
impedance setting.
Table 7-4
A12-Related Digital Control Signals
Mnemonic
Signal Description
Location
See Figure
Analyzer
Setting
L ENREF
L=Reference Enable
A12P2-16
Figure 7-15
Preset
L HB
L=High Band
A12P2-32
Figure 7-16
Preset
L LB
L=Low Band
A12P1-23
Figure 7-16
Preset
L ENREF Line This is a TTL signal. To observe it, trigger on the negative edge. In
preset state, the signal should show activity similar to Figure 7-15.
Figure 7-15
L ENREF Line at A12P2-16 (Preset)
L HB and L LB Lines These complementary signals toggle when the instrument
switches from low band to high band as illustrated by Figure 7-16.
7-18
Chapter 7
Source Troubleshooting
Phase Lock Error
Figure 7-16
Complementary L HB and L LB Signals (Preset)
If all of the digital signals appear good, the A12 assembly is faulty.
Chapter 7
7-19
Source Troubleshooting
Phase Lock Error
A13/A14 Fractional-N Check
Use the analog bus or an oscilloscope to check the A14 VCO's ability to sweep from 30 MHz
to 60 MHz. The faster analog bus method should suffice unless problems are detected.
Fractional-N Check with Analog Bus
1. Press Preset
System SERVICE MENU ANALOG BUS ON Meas
S PARAMETERS ANALOG IN Aux Input FRAC N to switch on the analog bus and
the fractional-N counter.
2. Press Sweep Setup
CW FREQ to set the analyzer to CW mode.
3. Set the instrument as indicated in Table 7-5 and see whether the VCO generates the
frequencies listed.
Table 7-5
VCO Range Check Frequencies
Instrument Setting
Counter Reading
31 MHz
30 ±0.030 MHz
60.999999 MHz
60 ±0.060 MHz
4. Check the counter reading at the frequencies indicated.
• If the readings are within the limits specified, the probability is greater than 90%
that the fractional-N assemblies are functional. Either skip ahead to the “A7 Pulse
Generator Check” on page 7-25, or perform the more conclusive “A14 VCO Range
Check with Oscilloscope” described next.
• If the readings fail the specified limits, perform the “A14 VCO Exercise” on
page 7-22.
A14 VCO Range Check with Oscilloscope
1. Remove the W9 HI OUT cable (A14J1 to A7) from the A7 assembly and connect it to an
oscilloscope set for 50 ohm input impedance. Switch on the analyzer.
2. Press Preset
System SERVICE MENU SERVICE MODES FRACN TUNE ON to
activate the FRACN TUNE service mode. See Chapter 10 , “Service Key Menus and
Error Messages,” for more information on the FRACN TUNE mode.
3. Vary the fractional-N VCO frequency with the front panel knob and check the signal
with the oscilloscope. The waveform should resemble Figure 7-17, Figure 7-18, and
Figure 7-19.
If the fractional-N output signals are correct, continue source troubleshooting by
skipping ahead to “A7 Pulse Generator Check” on page 7-25.
7-20
Chapter 7
Source Troubleshooting
Phase Lock Error
Figure 7-17
10 MHz HI OUT Waveform from A14J1
Figure 7-18
25 MHz HI OUT Waveform from A14J1
Chapter 7
7-21
Source Troubleshooting
Phase Lock Error
Figure 7-19
60 MHz HI OUT Waveform from A14J1
A14 VCO Exercise
The nominal tuning voltage range of the VCO is +10 to −5 volts. When the analyzer is in
operation, this voltage is supplied by the A13 assembly. This procedure substitutes a power
supply for the A13 assembly to check the frequency range of the A14 VCO.
1. Switch off the analyzer and remove the A13 assembly.
2. Put the A14 assembly on an extender board and switch on the instrument.
3. Prepare to monitor the VCO frequency, either by:
• Activating the analog bus and setting the internal counter to the FRACN node, or
• Connecting an oscilloscope to A14J2 (labeled LO OUT) and looking for waveforms
similar to Figure 7-20.
Figure 7-20
7-22
LO OUT Waveform at A14J2
Chapter 7
Source Troubleshooting
Phase Lock Error
4. Vary the voltage at A14TP14 from +10 to −5 volts either by:
• Connecting an appropriate external power supply to A14TP14, or
• First jumping the +15 V internal power supply from A8TP8 to A14TP14 and then
jumping the −5.2 V supply from A8TP10 to A14TP14.
5. Confirm that the VCO frequency changes from approximately 30 MHz or less to
60 MHz or more.
6. If this procedure produces unexpected results, the A14 assembly is faulty.
7. If this procedure produces the expected results, continue with the “A14 Divide-by-N
Circuit Check” on page 7-23.
A14 Divide-by-N Circuit Check
NOTE
The A13 assembly should still be out of the instrument and the A14 assembly
on an extender board.
1. Ground A14TP14 and confirm (as in the A14 VCO Exercise) that the VCO oscillates at
approximately 50 to 55 MHz.
2. Put the analyzer in CW mode (to avoid relock transitions) and activate the FRACN
TUNE service mode.
3. Connect an oscilloscope to A14J3 and observe the output.
4. With the FRACN TUNE service feature, vary the frequency from 30 MHz to 60.8 MHz.
5. The period of the observed signal should vary from 5.5 µs to 11 µs.
• If this procedure produces unexpected results, the A14 assembly is faulty.
• If this procedure produces the expected results, perform the “A14-to-A13 Digital
Control Signals Check,” next.
6. Remember to replace the A13 assembly.
A14-to-A13 Digital Control Signals Check
The A14 assembly generates a TTL cycle start (CST) signal every 10 microseconds. If the
VCO is oscillating and the CST signal is not detectable at A14TP3, the A14 assembly is
non-functional.
Use the CST signal as an external trigger for the oscilloscope and monitor the signals in
Table 7-6. Since these TTL signals are generated by A14 to control A13, check them at A13
first. Place A13 on the large extender board. The signals should look similar to Figure 7-21.
If these signals are good, the A13 assembly is defective.
Chapter 7
7-23
Source Troubleshooting
Phase Lock Error
Table 7-6
A14-to-A13 Digital Control Signal Locations
Mnemonic
A13 Location
A14 Location
CST
none
TP3
L FNHOLD
P2-2
P2-2
FNBIAS
P2-5
P2-5
API1
P2-32
P2-32
API2
P2-3
P2-3
API3
P2-34
P2-34
API4
P2-4
P2-4
API5
P2-35
P2-35
FN LATCH
P1-28
P1-58
Figure 7-21
A14 Generated Digital Control Signals
H MB Line This signal is active during the 16 MHz to 31 MHz sweep. The upper trace of
Figure 7-22 shows relative inactivity of this signal during preset condition. The lower trace
shows its status during a 16 MHz to 31 MHz sweep with inactivity during retrace only.
7-24
Chapter 7
Source Troubleshooting
Phase Lock Error
Figure 7-22
H MB Signal at A14P1-5 (Preset and 16 MHz to 31 MHz Sweep)
A7 Pulse Generator Check
The pulse generator affects phase lock in high band only. It can be checked with either a
spectrum analyzer or an oscilloscope.
A7 Pulse Generator Check with Spectrum Analyzer
1. Remove the A7-to-A6 SMB cable (W7) from the A7 pulse generator assembly. Set the
analyzer to generate a 16 MHz CW signal. Connect the spectrum analyzer to the A7
output connector and observe the signal. The A7 comb should resemble the spectral
display in Figure 7-23.
Figure 7-23
Chapter 7
Pulse Generator Output
7-25
Source Troubleshooting
Phase Lock Error
2. If the analyzer malfunction relates to a particular frequency or range, look more closely
at the comb tooth there. Adjust the spectrum analyzer span and bandwidth as required.
Even at 3 GHz, the comb should look as clean as Figure 7-24. For Option 006
instruments at 6 GHz, the comb tooth level should be approximately −46 dBm.
Figure 7-24
High Quality Comb Tooth at 3 GHz
3. If the signal at the A7 output is good, check the A7-to-A4 cable.
4. If the signal is not as clean as Figure 7-24, observe the HI OUT input signal to the A7
assembly.
a. On the network analyzer, press System SERVICE MENU SERVICE MODES
PLL AUTO OFF . Otherwise do not readjust the instrument. Remove the A14-to-A7
SMB cable (W9) from the A7 pulse generator assembly (CW ≈ 16 MHz).
b. Set the spectrum analyzer to a center frequency of 45 MHz and a span of 30 MHz.
Connect it to the A14-to-A7 cable still attached to the A14 assembly. Narrow the
span and bandwidth to observe the signal closely.
5. If the HI OUT signal is as clean as Figure 7-25, the A7 assembly is faulty.
Otherwise, check the A14-to-A7 cable or recheck the A13/A14 fractional-N as described
ahead.
Rechecking the A13/A14 Fractional-N
Some phase lock problems may result from phase noise problems in the fractional-N loop.
To troubleshoot this unusual failure mode, do the following:
1. Set the network analyzer at 60 MHz in the FRACN TUNE mode.
2. Use a spectrum analyzer, to examine the HI OUT signal from the A14 assembly. The
signal should appear as clean as Figure 7-25. The comb shape may vary from pulse
generator to pulse generator.
7-26
Chapter 7
Source Troubleshooting
Phase Lock Error
Figure 7-25
Stable HI OUT Signal in FRACN TUNE Mode
A7 Pulse Generator Check with Oscilloscope
Perform this check if a spectrum analyzer is not available.
1. Remove the A4-to-A11 SMB cable from the A4 (R) sampler/mixer output. Connect the
oscilloscope to the A4 output (1st IF).
2. Activate the FRACN TUNE service mode and tune the fractional-N to 50 MHz. Press
System SERVICE MENU SERVICE MODES FRACN TUNE ON 50
M/µ .
3. Activate the SRC service mode of the analyzer and tune the source to 50 MHz. Press
SRC ADJUST MENU SRC TUNE ON SRC TUNE FREQ 50
M/µ .
4. Set the SRC TUNE frequency to those listed in Table 7-7 and observe the 1st IF
waveforms. They should appear similar to Figure 7-26.
• If the signals observed are proper, continue with “A11 Phase Lock Check” on
page 7-28.
• If the signals observed are questionable, use a spectrum analyzer to perform the
“A7 Pulse Generator Check with Spectrum Analyzer” on page 7-25.
Table 7-7
1st IF Waveform Settings
SRC TUNE
FRACN
Harmonic
1st IF
50 MHz
50 MHz
1
1 to 6 MHz
250 MHz
50 MHz
5
1 to 6 MHz
2550 MHz
50 MHz
51
1 to 6 MHz
Chapter 7
7-27
Source Troubleshooting
Phase Lock Error
Figure 7-26
Typical 1st IF Waveform in FRACN TUNE/SRC TUNE Mode
A11 Phase Lock Check
At this point, the A11 phase lock assembly appears to be faulty (its inputs should have
been verified already). Nevertheless, you may elect to use the phase lock diagnostic
routines or check the relevant signals at the assembly itself for confirmation.
NOTE
If external source mode is the only operating mode with phase lock problems,
replace the A11 phase lock assembly.
Phase Lock Check with PLL DIAG
Refer to “Phase Lock Diagnostic Tools” on page 7-30 for an explanation of the error
messages and the diagnostic routines. Follow the steps there to determine in which state
the phase lock is lost.
• If NO IF FOUND is displayed, confirm that the analog bus is functional and perform
“Source Pretune Correction Constants (Test 48)” on page 3-10.
• If phase lock is lost in the ACQUIRE state, the A11 assembly is faulty.
• If phase lock is lost in the TRACK state, troubleshoot source phase lock loop
components other than the A11 assembly.
7-28
Chapter 7
Source Troubleshooting
Phase Lock Error
Phase Lock Check by Signal Examination
To confirm that the A11 assembly is receiving the signals required for its proper operation,
perform the following steps.
1. Place the A11 assembly on the large extender board.
2. Switch on the analyzer and press Preset .
3. Check for the signals listed in Table 7-8.
Table 7-8
A11 Input Signals
Mnemonic
I/O
FM COIL −
O
Access
See Figure
Notes
A11P1-3,33
Figure 7-27
Aids YO COIL in setting YIG. Press Preset
Sweep Setup NUMBER OF POINTS
3
x1 to observe this signal.
REF
I
A11TP9
Figure 7-9,
Figure 7-10
Observe both low band and high band CW
frequencies.
YO COIL +
O
A11P1-2,32
Figure 7-7
Use SOURCE PLL OFF .
YO COIL −
O
A11P1-1,31
Figure 7-7
1ST IF
I
A11 PL IF IN
Figure 7-26
Figure 7-27
Check for 1 MHz with tee a A11 jack (not at cable
end) in high band. Use A7 pulse generator check
setup.
FM Coil – Plot with 3 Point Sweep
4. If any of the input signal is not proper, refer to the overall block diagram in Chapter 4 ,
“Start Troubleshooting Here,” as an aid to troubleshooting the problem to its source.
5. If any of the output signals is not proper, the A11 assembly is faulty.
Chapter 7
7-29
Source Troubleshooting
Source Group Troubleshooting Appendix
Source Group Troubleshooting Appendix
Troubleshooting Source Problems with the Analog Bus
The analog bus can perform a variety of fast checks. However, it too is subject to failure
and thus should be tested prior to use. You should have done this in Chapter 4 , “Start
Troubleshooting Here.”
To use the analog bus to check any one of the nodes, press Preset
System
SERVICE MENU ANALOG BUS IN . Then press Meas S PARAMETERS
S PARAMETERS ANALOG IN Aux Input and enter the analog bus node number
followed by x1 . Refer to “Analog Bus” on page 10-20 for additional information.
Phase Lock Diagnostic Tools
• error messages
• diagnostic routines
Phase Lock Error Messages
All phase lock error messages can result from improper front panel connections.
NO IF FOUND: CHECK R INPUT LEVEL means no IF was detected during pretune: a source
problem. Perform the “A4 Sampler/Mixer Check” on page 7-8.
NO PHASE LOCK: CHECK R INPUT LEVEL means the IF was not acquired after pretune: a
source problem. Perform the “A4 Sampler/Mixer Check” on page 7-8.
PHASE LOCK CAL FAILED means that a calculation of pretune values was not successful: a
source or receiver failure. Perform “Source Pretune Correction Constants (Test 48)” on
page 3-10. If the analyzer fails that routine, perform the “A4 Sampler/Mixer Check” on
page 7-8.
PHASE LOCK LOST means that phase lock was lost or interrupted before the band sweep
ended: a source problem. Refer to “Phase Lock Diagnostic Routines,” next, to access the
phase lock loop diagnostic service routine. Then troubleshoot the problem by following the
procedures in this chapter.
7-30
Chapter 7
Source Troubleshooting
Source Group Troubleshooting Appendix
Phase Lock Diagnostic Routines
Perform the following steps to determine at what frequencies and bands the phase lock
problem occurs.
1. Press Preset
System SERVICE MENU SERVICE MODES PLL AUTO OFF to
switch off the automatic phase-locked loop. Normally, when the phase-locked loop
detects lock problems, it automatically aborts the sweep and attempts to recalibrate the
pretune cycle. Switching off PLL AUTO defeats this routine.
2. Press PLL DIAG ON to switch on the phase-locked loop diagnostic service mode. In
this mode, the phase lock cycle and subsweep number are displayed on the analyzer
display. (See “Service Modes Menu” on page 10-16 for more information.)
3. Press PLL PAUSE to pause the phase lock sequence and determine where the source
is trying to tune when lock is lost.
Refer to “Source Theory Overview” on page 12-14 for additional information regarding
band related problems. Then use the procedures in this chapter to check source functions
at specific frequencies.
Chapter 7
7-31
Source Troubleshooting
Source Group Troubleshooting Appendix
7-32
Chapter 7
8 Receiver Troubleshooting
8-1
Receiver Troubleshooting
Receiver Troubleshooting
Receiver Troubleshooting
Use this procedure only if you have read Chapter 4 , “Start Troubleshooting Here.” Follow
the procedures in the order given, unless instructed otherwise.
The receiver group assemblies consist of the following:
• A4/A5/A6 sampler/mixer assemblies
• A10 digital IF assembly
8-2
Chapter 8
Receiver Troubleshooting
Assembly Replacement Sequence
Assembly Replacement Sequence
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
Chapter 8
8-3
Receiver Troubleshooting
Receiver Failure Error Messages
Receiver Failure Error Messages
The error messages which indicate receiver group problems may be caused by the
instrument itself or by external devices or connections. The following three error messages
share the same description.
• CAUTION: OVERLOAD ON INPUT A, POWER REDUCED
• CAUTION: OVERLOAD ON INPUT B, POWER REDUCED
• CAUTION: OVERLOAD ON INPUT R, POWER REDUCED
If any of the above error messages appear, the analyzer has exceeded approximately
+14 dBm at one of the test ports. The RF output power is automatically reduced to −85
dBm. The annotation P↓ appears in the left margin of the display to indicate that the
power trip function has been activated. To reset the analyzer's power and regain control of
the power level, do the following:
1. Remove any devices under test which may have contributed excess power to the input.
2. Press Power
state.
0
x1
POWER TRIP OFF to return the power level to the preset
• If the power trip indicator (P↓) does not reappear, reconfigure the test setup to keep
input power levels at 0 dBm or below.
• If P↓ reappears, go to “Observe the A and B Input Traces” on page 4-17.
8-4
Chapter 8
Receiver Troubleshooting
Check the R, A, and B Inputs
Check the R, A, and B Inputs
Good inputs produce traces similar to Figure 8-2 in terms of flatness. To examine each
input trace, do the following:
1. Connect the equipment as shown in Figure 8-1. (The through cable part number is
8120-4781.)
Figure 8-1
Equipment Setup
2. Check the flatness of the input R trace by comparing it with the trace in Figure 8-2.
NOTE
The R trace will be 20 dB lower than the A and B trace due to the attenuator
on the R input. the flatness of the trace, however, should resemble that of the
A and B input traces.
Press Preset
Meas
R
Scale Ref
AUTO SCALE .
3. Check the flatness of the input A trace by comparing it with the trace in Figure 8-2.
Press Meas
A.
4. Check the flatness of the input B trace by comparing it with the trace in Figure 8-2.
Move the A input cable to the B input and press B .
• If none of the input traces resembles Figure 8-2, continue with “Troubleshooting
When All Inputs Look Bad” on page 8-7.
Chapter 8
8-5
Receiver Troubleshooting
Check the R, A, and B Inputs
• If at least one input resembles Figure 8-2, continue with “Troubleshooting When One
or More Inputs Look Good” on page 8-11.
Figure 8-2
8-6
Typical Good Trace
Chapter 8
Receiver Troubleshooting
Troubleshooting When All Inputs Look Bad
Troubleshooting When All Inputs Look Bad
Run Internal Tests 18 and 17
1. Press Preset
System
run the ADC offset.
SERVICE MENU
TESTS
2. Then, when the analyzer finishes test 18, press 17
ADC linearity test.
18
x1
x1
EXECUTE TEST to
EXECUTE TEST to run the
If either of these tests FAIL, the A10 assembly is probably faulty. This can be confirmed by
checking the 4 MHz signal and substituting the A10 assembly or checking the signals
listed in Table 8-1 on page 8-9.
Check 2nd LO
Check the 2nd LO signal. Refer to “A12 Reference Check” on page 7-12 for analog bus and
oscilloscope checks of the 2nd LO and waveform illustrations.
• If the analyzer passes the checks, continue to “Check the 4 MHz REF Signal,” next.
• If the analyzer fails the checks, perform the “High/Low Band Transition Adjustment” on
page 3-45. If the adjustment fails, or brings no improvement, replace A12.
Chapter 8
8-7
Receiver Troubleshooting
Check the 4 MHz REF Signal
Check the 4 MHz REF Signal
1. Connect a cable from the RF OUT port to input R.
2. Press Preset .
3. Use an oscilloscope to observe the 4 MHz reference signal at A10P2-6.
• If the signal does not resemble Figure 8-3, troubleshoot the signal source (A12P2-36)
and path.
• If the signal is good, the probability is greater than 90% that the A10 assembly is
faulty. For confirmation, perform “Check A10 by Substitution or Signal
Examination,” next.
Figure 8-3
8-8
4 MHz REF Waveform
Chapter 8
Receiver Troubleshooting
Check the 4 MHz REF Signal
Check A10 by Substitution or Signal Examination
If the 4 MHz REF signal is good at the A10 digital IF assembly, check the A10 assembly by
one of the following methods:
• Substitute another A10 assembly or
• Check the signal/control lines required for its operation. The pins and signal sources of
those lines are identified in Table 8-1. It is possible that the A9 assembly may not be
providing the necessary signals. These signal checks allow you to determine which
assembly is faulty. Some of the waveforms are illustrated by Figure 8-4 and Figure 8-5.
If the substitute assembly shows no improvement or if all of the input signals are valid,
continue with “Check the 4 kHz Signal” on page 8-11. Otherwise, troubleshoot the suspect
signals or consider the A10 assembly faulty.
Table 8-1
Signals Required for A10 Assembly Operation
Mnemonic
Description
A10
Location
Signal
Source
See Figure
DIFD0
Digital IF data 0 (LSB)
P2-27
A9P2-27
*
DIFD1
Digital IF data 1
P2-57
A9P2-57
*
DIFD2
Digital IF data 2
P2-28
A9P2-28
*
DIFD3
Digital IF data 3
P2-58
A9P2-58
*
DIFD4
Digital IF data 4
P2-29
A9P2-29
*
DIFD5
Digital IF data 5
P2-59
A9P2-59
*
DIFD6
Digital IF data 6
P2-30
A9P2-30
*
DIFD7
Digital IF data 7 (MSB)
P2-60
A9P2-60
*
L DIFEN0
Digital IF enable 0
P2-34
A9P2-34
*
L DIFEN1
Digital IF enable 1
P2-5
A9P2-5
*
L DIFEN2
Digital IF enable 2
P2-35
A9P2-35
*
DIFCC
Digital IF conversion comp.
P2-33
A10P2-33
Figure 8-4
DIFCLK
Digital IF serial clock
P2-4
A10P2-4
Figure 8-4
DIF DATA
Digital IF serial data out
P2-3
A10P2-3
Figure 8-4
L ENDIF
L=enable digital IF
P2-17
A9P2-17
Figure 8-5
L INTCOP
L=interrupt, DSP
P2-2
A10P2-2
Figure 8-5
*Check for TTL activity.
Chapter 8
8-9
Receiver Troubleshooting
Check the 4 MHz REF Signal
Figure 8-4
Digital Data Lines Observed Using L INTCOP as Trigger
Figure 8-5
Digital Control Lines Observed Using L INTCOP as Trigger
8-10
Chapter 8
Receiver Troubleshooting
Troubleshooting When One or More Inputs Look Good
Troubleshooting When One or More Inputs Look Good
Since at least one input is good, all of the common receiver circuitry beyond the
multiplexer is functional. Only the status of the individual sampler/mixers and their
individual signal paths is undetermined.
Check the 4 kHz Signal
1. Connect a cable from the RF OUT port to input R.
2. Press Preset
Menu
CW FREQ .
3. Use an oscilloscope to check the 4 kHz output of the sampler/mixer in question at the
A10 assembly. The input and output access pins are listed in Table 8-2. The signal
should resemble the waveform of Figure 8-6.
• If the signal is good, continue with “Check the Trace with the Sampler Correction
Constants Off” on page 8-12.
• If the signal is bad, skip ahead to “Check 1st LO Signal at Sampler/Mixer” on
page 8-12.
Table 8-2
2nd IF (4 kHz) Signal Locations
Mnemonic
Description
A10 Location
Signal Source
IFR
4 kHz
A10P1-1, 31
A4P1-6
IFA
4 kHz
A10P1-4, 34
A5P1-6
IFB
4 kHz
A10P1-7, 37
A6P1-6
Figure 8-6
Chapter 8
2nd IF (4 kHz) Waveform
8-11
Receiver Troubleshooting
Troubleshooting When One or More Inputs Look Good
Check the Trace with the Sampler Correction Constants Off
1. Press Preset
Meas
A
Scale Ref
AUTO SCALE .
2. The trace is currently being displayed with the sampler correction constants on and
should resemble Figure 8-7a.
3. Press System
SERVICE MENU
SERVICE MODES
MORE
SAMPLER COR OFF .
4. The trace is now being displayed with sampler correction constants off and should have
worsened to resemble Figure 8-7b.
5. Press SAMPLER COR ON . The trace should improve and resemble Figure 8-7a again.
NOTE
When the correction constants are switched off, an absolute offset and
bandswitch points may be evident.
If the trace shows no improvement when the sampler correction constants are toggled from
off to on, perform “Sampler Magnitude and Phase Correction Constants (Test 53)” on
page 3-19. If the trace remains bad after this adjustment, the A10 assembly is defective.
Figure 8-7
Typical Trace with Sampler Correction On and Off
Check 1st LO Signal at Sampler/Mixer
If the 4 kHz signal is bad at the sampler/mixer assembly, check the 1st LO signal where it
enters the sampler/mixer assembly in question.
• If the 1st LO is faulty, check the 1st LO signal at its output connector on the A7
assembly to determine if the failure is in the cable or the assembly.
• If the 1st LO is good, continue with “Check 2nd LO Signal at Sampler/Mixer,” next.
8-12
Chapter 8
Receiver Troubleshooting
Troubleshooting When One or More Inputs Look Good
Check 2nd LO Signal at Sampler/Mixer
Check the 2nd LO signal at the pins identified in Table 8-3. Refer to the “A12 Reference
Check” on page 7-12 for analog bus and oscilloscope checks of the 2nd LO and waveform
illustrations. Table 8-3 identifies the signal location at the samplers and the A12 assembly.
Table 8-3
2nd LO Locations
Mnemonic
Description
Sampler
Location
Signal Source
2nd LO 1
2nd LO (0 degrees)
A4/5/6 P1-11
A12P1-2, 32
2nd LO 2
2nd LO (−90 degrees)
A4/5/6 P1-4
A12P1-4, 34
If the 2nd LO is good at the sampler/mixer, the sampler/mixer assembly is faulty.
Otherwise, troubleshoot the A12 assembly and associated signal path.
Chapter 8
8-13
Receiver Troubleshooting
Troubleshooting When One or More Inputs Look Good
8-14
Chapter 8
9 Accessories Troubleshooting
9-1
Accessories Troubleshooting
Accessories Troubleshooting
Accessories Troubleshooting
Use this procedure only if you have read Chapter 4 , “Start Troubleshooting Here.” Follow
the procedures in the order given, unless instructed otherwise.
Measurement failures can be divided into two categories:
• Failures which don't affect the normal functioning of the analyzer but render incorrect
measurement data.
• Failures which impede the normal functioning of the analyzer or prohibit the use of a
feature.
This chapter addresses the first category of failures which are usually caused by the
following:
• operator errors
• faulty calibration devices or connectors
• bad cables or adapters
• improper calibration techniques
• RF cabling problems within the test set.
These failures are checked using the following procedures:
• “Inspect the Accessories” on page 9-4
• “Inspect the Error Terms” on page 9-5
• “Test Set Troubleshooting” on page 9-8
9-2
Chapter 9
Accessories Troubleshooting
Assembly Replacement Sequence
Assembly Replacement Sequence
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
Chapter 9
9-3
Accessories Troubleshooting
Inspect the Accessories
Inspect the Accessories
Inspect the Test Port Connectors and Calibration Devices
1. Check for damage to the mating contacts of the test port center conductors and loose
connector bulkheads.
2. Check the test set and power splitter connectors for defects as well.
3. Inspect the calibration kit devices for bent or broken center conductors and other
physical damage. Refer to the calibration kit operating and service manual for
information on gaging and inspecting the device connectors.
If any calibration device is obviously damaged or out of mechanical tolerance, replace
the device.
Switch Repeatability
Calibration does not compensate for the repeatability for the repeatability of the
mechanical transfer switch in S-parameter test sets, so the switch can be a source of error.
However, most switch failures are not subtle: no action.
S PARAMETERS
Connect the test set to the analyzer. Press Preset
Meas
REFL: REV S22 (B/R) and then REFL: FWD S11 (A/R) . Listen for the sound of the
switch.
• No sound: confirm that the test set has a solid-state (noiseless) switch, then refer to
“Test Set Troubleshooting” on page 9-8 to locate the problem.
• Audible sound: continue with this section unless a subtle failure is suspected. To
troubleshoot subtle failures, refer to the test set manual.
9-4
Chapter 9
Accessories Troubleshooting
Inspect the Error Terms
Inspect the Error Terms
Error terms are a measure of a “system”: a network analyzer, calibration kit, and any
cables used. As required, refer to Chapter 11 , “Error Terms,” for the following:
• The specific measurement calibration procedure used to generate the error terms.
• The routines required to extract error terms from the instrument.
• Typical error term data.
Use Table 9-1 to cross-reference error term data to system faults.
Table 9-1
Components Related to Specific Error Terms
Component
Directivity
Source
Match
Reflection
Tracking
Isolation
Load
Match
Transmission
Tracking
Calibration Kit
load
X
open/short
X
X
connectors
X
X
X
X
X
X
bridge
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
step attenuator
X
X
X
X
power splitter
X
X
X
X
Test Set
bias tee
transfer switch
X
Analyzer
sampler
X
A10 digital IF
test port connectors
External cables
Chapter 9
X
X
X
X
X
X
X
X
X
X
X
9-5
Accessories Troubleshooting
Inspect the Error Terms
If you detect problems using error term analysis, use the following approach to isolate the
fault:
1. Check the cable by examining the load match and transmission tracking terms. If those
terms are incorrect, go to “Cable Test” on page 9-6.
2. Verify the calibration kit devices:
• Loads: If the directivity error term looks good, the load and the test port are good. If
directivity looks bad, connect the same load on the other test port and measure its
directivity. If the second port looks bad, as if the problem had shifted with the load,
replace the load. If the second port looks good, as if the load had not been the
problem, troubleshoot the first port.
• Shorts and opens: If the source match and reflection tracking terms look good, the
shorts and the opens are good. If these terms look bad while the rest of the terms
look good, proceed to “Verify Shorts and Opens” on page 9-7.
Cable Test
The load match error term is a good indicator of cable problems. You can further verify a
faulty cable by measuring the reflection of the cable. Perform an S11 1-port calibration
directly at port 1 (no cables). Then connect the suspect cable to port 1 and terminate the
open end in 50 ohms.
Figure 9-1 shows the return loss trace of a good (left side) and faulty cable. Note that the
important characteristic of a cable trace is its level (the good cable trace is much lower) not
its regularity. Refer to the cable manual for return loss specifications.
Figure 9-1
9-6
Typical Return Loss Traces of Good and Poor Cables
Chapter 9
Accessories Troubleshooting
Inspect the Error Terms
Verify Shorts and Opens
Substitute a known good short and open of the same connector type and sex as the short
and open in question. If the devices are not from one of the standard calibration kits, refer
to the analyzer’s user’s guide for information on how to use the MODIFY CAL KIT
function. Set aside the short and open that are causing the problem.
1. Perform an S11 1-port calibration using the good short and open. Then press Format
SMITH CHART to view the devices in Smith chart format.
2. Connect the good short to port 1. Press Scale Ref ELECTRICAL DELAY and turn
the front panel knob to enter enough electrical delay so that the trace appears as a dot
at the left side of the circle. (See Figure 9-2a, left.)
Replace the good short with the questionable short at port 1. The trace of the
questionable short should appear very similar to the known good short.
3. Connect the good open to port 1. Press Scale Ref ELECTRICAL DELAY and turn the
front panel knob to enter enough electrical delay so that the trace appears as a dot at
the right side of the circle. (See Figure 9-2b, right.)
Replace the good open with the questionable open at port 1. The trace of the
questionable open should appear very similar to the known good open.
Figure 9-2
Chapter 9
Typical Smith Chart Traces of Good Short (a) and Open (b)
9-7
Accessories Troubleshooting
Test Set Troubleshooting
Test Set Troubleshooting
Test set problems are of three varieties: RF problems, power problems, and control
problems. The HP/Agilent 85044A/B test set can only experience RF problems because it is
not powered by the analyzer.
To troubleshoot:
• The 85044A/B: refer to its manual.
• S-parameter test set problems: refer to the manuals.
• S-parameter power or control problems: continue with “Troubleshooting Power
Problems in S-Parameter Test Sets” (power problems can affect control).
Troubleshooting Power Problems in S-Parameter Test Sets
HP/Agilent 85047A or 85047A/B Test Sets
Do not connect the test set to the analyzer to perform these checks.
1. Move the A9 CC Switch to the ALTER position:
a. Remove the power line cord from the analyzer.
b. Set the analyzer on its side.
c. Remove the two corner bumpers from the bottom of the instrument with a T-15
TORX screwdriver.
d. Loosen the captive screw on the bottom cover’s back edge.
e. Slide the cover toward the rear of the instrument.
f. Move the switch to the ALT position as shown in Figure 9-3.
g. Replace the bottom cover, corner bumpers, and power cord.
9-8
Chapter 9
Accessories Troubleshooting
Test Set Troubleshooting
Figure 9-3
Switch Positions on the A9 CPU
2. Press Preset
x1 .
System
SERVICE MENU
PEEK/POKE ADDRESS
1619001527
3. “Poke” the address for the appropriate test set
• 85047A: Press POKE
• 85046A/B: Press POKE
5
x1
1
x1
Preset .
Preset .
4. Measure the DC voltage at pin 14 (see Figure 9-4) of the analyzer rear panel test set
interconnect connector.
Figure 9-4
Chapter 9
Test Set Interconnect Connector Pins
9-9
Accessories Troubleshooting
Test Set Troubleshooting
• If the voltage is between 21.3 V and 22.7 V, the supply is good. Proceed with either of
the following:
— Refer to the test set manual to troubleshoot the test set and its interconnect cable
(especially if the test set LEDs don’t light).
— Continue with “Troubleshooting Control Problems in S-Parameter Test Sets.”
5. Be certain to press POKE 0 x1 Preset after all troubleshooting and return the
A9 CC switch to the “normal” position.
Troubleshooting Control Problems in S-Parameter Test Sets
The analyzer controls the test set attenuator, the transfer switch (for forward and reverse
measurements), and, in the case of the 85047A, bypasses the frequency doubler. The
associated test set interconnect connector pins are shown in Figure 9-4: refer to it as
needed.
Before continuing with these procedures, be sure the A9 CC switch is set to
the “alter” position and the value for the appropriate test set has been
“POKEd.”
NOTE
Attenuation Control Voltages
Voltage levels on the pins identified in Table control the test set attenuation. Press
Power ATTENUATOR PORT 1 and enter the attenuation values listed below. After each
entry, check the pins (see Figure 9-4) for the indicated voltages.
Table 9-2
Attenuation
Attenuation Voltage Matrix
HP/Agilent 85046A/B
HP/Agilent 85047A
Pin 11
Pin 22
Pin 23
Pin 8
Pin 11
Pin 22
Pin 23
0
+5
+5
+5
+5
+5
+5
+5
10
+5
0
+5
+5
+5
0
+5
20
+5
+5
0
+5
+5
+5
0
30
+5
0
0
+5
+5
0
0
40
0
+5
+5
+5
0
+5
+5
50
0
0
+5
+5
0
0
+5
60
0
+5
0
+5
0
+5
0
70
0
0
0
+5
0
0
0
• Proper voltages: refer to the test set manual to continue troubleshooting. For
the 85047A systems, first see the note on page 9-10 to make sure that the appropriate
test set has been “POKEd.”
• Wrong voltages: replace the A16 rear panel assembly of the analyzer.
9-10
Chapter 9
Accessories Troubleshooting
Test Set Troubleshooting
Measurement Control Signals
Voltage levels on the pins identified in Table 9-3 control measurement direction (forward or
reverse) and the doubler off function. Press Meas S PARAMETERS and enter the
measurements listed below. After each entry, check the pins (see Figure 9-4) for the
indicated voltages.
Table 9-3
Measurement Voltage Matrix
HP/Agilent
85046A/B
HP/Agilent 85047A
Pin 8
Pin 8
Pin 22
Pin 23
Refl: FWD S11 (A/R)
+5
0
—
+5
Trans: FWD S21 (B/R)
+5
0
—
+5
Trans: REV S12 (B/R)
0
0
—
0
Refl: REV S22 (A/R)
0
0
—
0
Doubler OFF
—
0
+5
—
• Proper Voltages: refer to the test set manual to continue troubleshooting. For 85047A
systems, first make sure that the appropriate test set has been “POKEd.”
• Wrong voltages: replace the A16 rear panel assembly of the analyzer.
Remote Trigger
Monitor pin 24 with an oscilloscope. Press Preset : +5 should be present during preset.
After preset, a negative-going pulse to zero volts, about 200 nanoseconds long, should be
visible. The pulse should be present at the beginning of each sweep. To increase pulse
visibility, decrease the number of points to 3 and decrease the sweep time to
50 milliseconds on the analyzer.
• Proper pulse: refer to the test set manual to continue troubleshooting. For 85047A
systems, first make sure that the appropriate test set has been “POKEd.”
• Incorrect pulse: replace the analyzer A16 rear panel assembly.
Sweep Delay
This signal delays the start of the analyzer’s sweep to allow for test set switch settling
time. It also distinguishes, by encoding, the 85047A from the 85046A/B test sets. See the
test set manual for more detail. For 85047A systems, first make sure that the appropriate
test set has been “POKEd.”
Chapter 9
9-11
Accessories Troubleshooting
Test Set Troubleshooting
9-12
Chapter 9
10 Service Key Menus and Error
Messages
10-1
Service Key Menus and Error Messages
The functions available in the service key menus allow you to perform the following service
functions:
• test
• verify
• adjust
• control
• troubleshoot
The main section of this chapter, “Service Key Menus,” divides the menus into three
groups:
• “Internal Diagnostics Menus” on page 10-3
• “Service Feature Menus” on page 10-16
• “Firmware Revision Softkey” on page 10-41
Additionally, there are sections providing information on the following:
• “GPIB Service Mnemonic Definitions” on page 10-42
• “Error Messages” on page 10-44
10-2
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Service Key Menus
Internal Diagnostics Menus
The internal diagnostics menus are shown in Figure 10-1 and described in the following
tables. The following keys access the internal diagnostics menus:
•
TESTS
•
TEST OPTIONS
•
SELF DIAGNOSE
Figure 10-1
NOTE
Internal Diagnostics Menus
Throughout this service guide, these conventions are observed:
•
Hardkeys
are labeled front panel keys.
•
SOFTKEYS are display-defined keys (in the menus).
• GPIB COMMANDS (when applicable)
Chapter 10
10-3
Service Key Menus and Error Messages
Service Key Menus
Tests Menu
To access this menu, press System
SERVICE MENU
TESTS .
The Tests menu allows you to select or execute the service tests. The default is set to
internal test 1. To select a test via GPIB command, use the TEST[D] command.
NOTE
Descriptions of tests in each of the categories are given in “Test Descriptions”
on page 10-8.
The tests are divided by function into the following categories:
• Internal Tests (0–20)
• External Tests (21–26)
• System Verification Tests (27–43)
• Adjustment Tests (44–58)
• Display Tests (59–65)
• Test Patterns (66–80)
To access the first test in each category, press the category softkey. To access the other
tests, use the numeric keypad, step keys, or front panel knob. The test number, name, and
status abbreviation will be displayed in the active entry area of the display.
Table 10-1 shows the test status abbreviation that appears on the display, its definition,
and the equivalent GPIB code. The GPIB command to output the test status of the most
recently executed test is OUTPTESS. For more information, refer to “GPIB Service
Mnemonic Definitions” on page 10-42.
Table 10-1
Test Status Terms
Display Abbreviation
Definition
GPIB Code
PASS
PASS
0
FAIL
FAIL
1
-IP-
IN PROGRESS
2
(NA)
NOT AVAILABLE
3
-ND-
NOT DONE
4
DONE
DONE
5
10-4
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Table 10-2
Tests Menu Keys
Key
EXECUTE TEST
GPIB
Mnemonic
EXET
Description
Runs the selected test and may display these softkeys:
CONTINUE (TESR1) continues the selected test.
YES (TESR2) alters correction constants during
adjustment tests.
NEXT (TESR4) displays the next choice.
SELECT (TESR6) chooses the option indicated.
ABORT (TESR8) terminates the test and returns to
the tests menu.
INTERNAL TESTS
N/A
Evaluates the analyzer's internal operation. These tests are
completely internal and do not require external connections
or user interaction.
EXTERNAL TESTS
N/A
Evaluate the analyzer's external operation. These additional
tests require some user interaction (such as keystrokes).
SYS VER TESTS
N/A
Verifies the analyzer system operation by examining the
contents of the measurement calibration arrays. Refer to
Chapter 2 , “Performance Tests.” Information about the
calibration arrays is provided in Chapter 11 , “Error
Terms.”
ADJUSTMENT TESTS
N/A
Generates and stores the correction constants. For more
information, refer to Chapter 3 , “Adjustments and
Correction Constants.”
DISPLAY TESTS
Chapter 10
N/A
Checks for correct operation of the display and GSP board.
10-5
Service Key Menus and Error Messages
Service Key Menus
Test Options Menu
To access this menu, press System
Table 10-3
SERVICE MENU
TEST OPTIONS .
Test Options Menu Keys
Key
TEST OPTIONS
CONTINUE TEST
GPIB
Mnemonic
N/A
TESR1
Description
Accesses softkeys that affect the way tests (routines) run, or
supply necessary additional data.
Resumes the test from where it was stopped.
REPEAT on OFF
TO2
Toggles the repeat function on and off. When the function is
ON, the selected test will run 10,000 times unless you press
any key to stop it. The analyzer shows the current number of
passes and fails.
RECORD on OFF
TO1
Toggles the record function on and off. When the function is
on, certain test results are sent to a printer via GPIB. This is
especially useful for correction constants. The instrument
must be in system controller mode or pass control mode to
print (refer to your analyzer’s user’s guide for more
information on printing).
LIMITS [NORM/SPCL]
N/A
Selects either NORMal or SPeCiaL (tighter) limits for the
operator's check. The SPCL limits are useful for a guard
band.
PWR LOSS on OFF
PWRLOSS
LOSS/SENSR LISTS
N/A
Selects whether or not to use the power loss table for a power
meter calibration.
Accesses the power loss/sensor lists menu that contains the
following softkeys:
USE SENSOR A/B (USESENS<A|B>) selects the A or
B power sensor calibration factor list for use in power
meter calibration measurements.
CAL FACTOR SENSOR A (CALFSENA) accesses the
Edit List menu to allow modification of the calibration
data table for power sensor A.
CAL FACTOR SENSOR B (CALFSENB) accesses the
Edit List menu to allow modification of the calibration
data table for power sensor B.
POWER LOSS (POWLLIST) accesses the Edit List
menu to allow modification of the external power loss
data table that corrects coupled-arm power loss when a
directional coupler samples the RF output.
DUMP GRAPH
10-6
N/A
Generates printed graphs of verification results when
activated during a system verification.
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Edit List Menu
To access this menu, press System SERVICE MENU TEST OPTIONS
LOSS/SENSR LISTS , and then press one of the following: CAL FACTOR SENSOR A or
CAL FACTOR SENSOR B or POWER LOSS .
Table 10-4
Edit List Menu Keys
Key
SEGMENT
EDIT
GPIB
Mnemonic
N/A
SEDI[D]
Description
Selects a segment (frequency point) to be edited, deleted
from, or added to the current data table. Works with the
entry controls.
Allows modification of frequency, cal factor and loss values
previously entered in the current data table.
DELETE
SDEL
Deletes frequency, cal factor and loss values previously
entered in the current data table.
ADD
SADD
Adds new frequency, cal factor and loss values to the current
data table up to a maximum of 12 segments (frequency
points, PTS).
CLEAR LIST
CLEL
Deletes the entire current data table (or list) when YES is
pressed. Press NO to avoid deletion.
DONE
EDITDONE
Selects whether or not to use the power loss table for a power
meter calibration.
Self Diagnose Softkey
You can access the self diagnosis function by pressing System SERVICE MENU
SELF DIAGNOSE . This function examines, in order, the pass/fail status of all internal
tests and displays NO FAILURE FOUND if no tests have failed.
If a failure is detected, the routine displays the assembly or assemblies most probably
faulty and assigns a failure probability factor to each assembly.
Chapter 10
10-7
Service Key Menus and Error Messages
Service Key Menus
Test Descriptions
The analyzer has up to 80 routines that test, verify, and adjust the instrument. This
section describes those tests.
Internal Tests This group of tests runs without external connections or operator
interaction. All return a PASS or FAIL condition. All of these tests run on power-up and
PRESET except as noted.
Table 10-5
Test
Number
10-8
Internal Tests
Test Name
Description
0
ALL INT
Runs only when selected. It consists of internal tests 3–11, 13–16, and 20. Use
the front panel knob to scroll through the tests and see which failed. If all pass,
the test displays a PASS status. Each test in the subset retains its own test
status.
1
PRESET
Runs the following subset of internal tests: first, the ROM/RAM tests 2, 3, and
4; then tests 5–11, 14, 15, and 16. If any of these tests fail, this test returns a
FAIL status. Use the front panel knob to scroll through the tests and see which
failed. If all pass, this test displays a PASS status. Each test in the subset
retains its own test status. This same subset is available over GPIB as “TST?”.
It is not performed upon remote preset.
2
ROM
Part of the ROM/RAM tests and cannot be run separately. Refer to Chapter 6 ,
“Digital Control Troubleshooting,” for more information.
3
SRAM RAM
Verifies the A9 CPU SRAM (long-term) memory with a non-destructive
write/read pattern. A destructive version that writes over stored data at
power-on can be enabled by changing the 4th switch position of the A9 CPU
switch as shown below.
4
Main DRAM
Verifies the A9 CPU main memory (DRAM) with a non-destructive write/read
test pattern. A destructive version of this test is run during power-on. For
additional information, see Chapter 6 , “Digital Control Troubleshooting.”
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Table 10-5
Test
Number
Internal Tests
Test Name
Description
5
DSP Wr/Rd
Verifies the ability of the main processor and the DSP (digital signal processor),
both on the A9 CPU assembly, to communicate with each other through DRAM.
This also verifies that programs can be loaded to the DSP, and that most of the
main RAM access circuits operate correctly.
6
DSP RAM
Verifies the A9 CPU RAM associated with the digital signal processor by using
a write/read pattern.
7
DSP ALU
Verifies the A9 CPU high-speed math processing portions of the digital signal
processor.
8
DSP Intrpt
Tests the ability of the A9 CPU digital signal processor to respond to interrupts
from the A10 digital IF ADC.
9
DIF Control
Tests the ability of the A9 CPU main processor to write/read to the control
latches on the A10 digital IF.
10
DIF Counter
Tests the ability of the A9 CPU main processor to write/read to the triple
divider on the A10 CPU. It tests the A9 CPU data buffers and A10 digital IF, the
4 MHz clock from the A12 reference.
11
DSP Control
Tests the ability of the A9 CPU digital signal processor to write to the control
latches on the A10 digital IF. Feedback is verified by the main processor. It
primarily tests the A10 digital IF, but failures may be caused by the A9 CPU.
12
Fr Pan Wr/Rd
Tests the ability of the A9 CPU main processor to write/read to the front panel
processor. It tests the A2 front panel interface and processors A9 CPU data
buffering and address decoding. (See also tests 23 and 24.) This runs only when
selected.
13
GPIB
Tests the ability of the A9 CPU main processor to write/read to the rear panel
control elements. It tests the A16 rear panel, and A9 CPU data buffering and
address decoding. (It does not test the GPIB interface; for that, see the
analyzer’s programmer’s guide.) This runs only when selected or with ALL
INTERNAL.
14
Post Reg
Polls the status register of the A8 post-regulator, and flags these conditions:
heat sink too hot, inadequate air flow, or post-regulated supply shutdown.
15
Frac N Cont
Tests the ability of the A9 CPU main processor to write/read to the control
element on the A14 fractional-N (digital) assembly. The control element must be
functioning, and the fractional-N VCO must be oscillating (although not
necessarily phase-locked) to pass.
16
Sweep Trig
Tests the sweep trigger (L SWP) line from the A14 fractional-N to the A10
digital IF. The receiver with the sweep synchronizes L SWP.
17
ADC Lin
It tests the linearity of the A10 digital IF ADC using the built-in ramp
generator. The test generates a histogram of the ADC linearity, where each data
point represents the relative “width” of a particular ADC code. Ideally, all codes
have the same width; different widths correspond to non-linearities.
18
ADC Ofs
This runs only when selected. It tests the ability of the offset DAC, on the A10
digital IF, to apply a bias offset to the IF signals before the ADC input. This
runs only when selected.
Chapter 10
10-9
Service Key Menus and Error Messages
Service Key Menus
Table 10-5
Test
Number
Internal Tests
Test Name
Description
19
ABUS Test
Tests analog bus accuracy, by measuring several analog bus reference voltages
(all nodes from the A10 digital IF). This runs only when selected.
20
FN Count
Uses the internal counter to count the A14 fractional-N VCO frequency (120 to
240 MHz) and the divided fractional-N frequency (100 kHz). It requires the
100 kHz signal from A12 and the counter gate signal from A10 to pass.
External Tests These tests require either external equipment and connections or
operator interaction of some kind to run. Tests 30 and 60 are comprehensive front panel
checks, more complete than test 12, that checks the front panel keys and knob entry.
Table 10-6
External Tests
Test
Number
Test Name
Description
21
Port 1 Op Chk
Part of “Step 2. Operator's Check” on page 4-6. The procedure requires the
external connection of a short to PORT 1.
22
Port 2 Op Chk
Same as 21, but tests PORT 2.
23
Fr Pan Seq
Tests the front panel knob entry and all A1 front panel keys, as well as the
front panel microprocessor on the A2 assembly. It prompts the user to rotate
the front panel knob, then press each key in an ordered sequence. It continues
to the next prompt only if the current prompt is correctly satisfied.
24
Fr Pan Diag
Similar to 23 above, but the user rotates the front panel knob or presses the
keys in any order. This test displays the command the instrument received.
25
ADC Hist
Factory use only.
26
Source Ex
Factory use only.
10-10
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
System Verification Tests These tests apply mainly to system-level, error-corrected
verification and troubleshooting. Tests 27 to 31 are associated with the system verification
procedure, documented in Chapter 2 , “Performance Tests.” Tests 32 to 43 facilitate
examining the calibration coefficient arrays (error terms) resulting from a measurement
calibration; refer to Chapter 11 , “Error Terms,” for details.
Table 10-7
Test
Number
System Verification Tests
Test Name
Description
27
Sys Ver Init
Recalls the initialization state for system verification from an 8753ES
verification disk, in preparation for a measurement calibration. It must be done
before service internal tests 28, 29, 30, or 31 are performed.
28
Ver Dev 1
Recalls verification limits from disk for verification device #1 in all applicable
measurements. It performs pass/fail limit testing of the current measurement.
29
Ver Dev 2
Same as 28 above for device #2.
30
Ver Dev 3
Same as 28 above for device #3.
31
Ver Dev 4
Same as 28 above for device #4.
Cal Coef 1–12
Copies error term data from a measurement calibration array to display
memory. A measurement calibration must be complete and active. The
definition of calibration arrays depends on the current calibration type. After
execution, the memory is automatically displayed. Refer to Chapter 11 ,
“Error Terms,” for details.
32–43
Chapter 10
10-11
Service Key Menus and Error Messages
Service Key Menus
Adjustment Tests These tests (except as noted) are used in the procedures located in
Chapter 3 , “Adjustments and Correction Constants.”
Table 10-8
Test
Number
Adjustment Tests
Test Name
Description
44
Source Def
Writes default correction constants for rudimentary source power accuracy. Use
this test before running test 47, below.
45
Pretune Def
Writes default correction constants for rudimentary phase lock pretuning
accuracy. Use this test before running test 48, below.
46
ABUS Cor
Measures three fixed voltages on the ABUS, and generates new correction
constants for ABUS amplitude accuracy in both high resolution and low
resolution modes. Use this test before running test 48, below.
47
Source Cor
Measures source output power accuracy, flatness, and linearity against an
external power meter via GPIB to generate new correction constants. Run tests
44, 45, 46, and 48 first.
48
Pretune Cor
Generates source pretune values for proper phase-locked loop operation. Run
tests 44, 45, and 46 first.
50
Disp 2 Exa
Writes the “secondary test pattern” to the display for adjustments. Press
Preset
to exit this routine.
51
IF Step Cor
Measures the gain of the IF amplifiers (A and B only) located on the A10 digital
IF, to determine the correction constants for absolute amplitude accuracy. It
provides smooth dynamic accuracy and absolute amplitude accuracy in the −30
dBm input power region.
52
ADC Ofs Cor
Measures the A10 Digital IF ADC linearity characteristics, using an internal
ramp generator, and stores values for the optimal operating region. During
measurement, IF signals are centered in the optimal region to improve
low-level dynamic accuracy.
53
Sampler Cor
Measures the absolute amplitude response of the R sampler against an external
power meter via GPIB, then compares A and B, (magnitude and phase), against
R. It improves the R input accuracy and A/B/R tracking.
54
Cav Osc Cor
Calculates the frequency of the cavity oscillator and the instrument
temperature for effective spur avoidance.
55
Serial Cor
Stores the serial number (input by the user in the Display Title menu) in
EEPROM. This routine will not overwrite an existing serial number.
56
Option Cor
Stores the option keyword (required for Option 002, 006, 010 or any
combination).
57
58
Not used
Init
EEPROM
This test initializes certain EEPROM addresses to zeros and resets the display
intensity correction constants to the default values. Also, the test will not alter
the serial number and correction constants for Option 002, 006, and 010.
a. Not used in the adjustment procedures.
10-12
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Display Tests These tests return a PASS/FAIL condition. All six amber front panel
LEDs will turn off if the test passes. Press Preset to exit the test. If any of the six LEDs
remain on, the test has failed.
Table 10-9
Display Tests
Test
Number
Test Name
Description
59
Disp/cpu com
Checks to confirm that the CPU can communicate with the A19 GSP board. The
CPU writes all zeros, all ones, and then a walking one pattern to the GSP and
reads them back. If the test fails, the CPU repeats the walking 1 pattern until
Preset is pressed.
60
DRAM cell
Tests the DRAM on A19 by writing a test pattern to the DRAM and then
verifying that it can be read back.
61
Main VRAM
Tests the VRAM by writing all zeros to one location in each bank and then
writing all ones to one location in each bank. Finally a walking one pattern is
written to one location in each bank.
62
VRAM bank
Tests all the cells in each of the 4 VRAM banks.
63
VRAM/video
Verifies that the GSP is able to successfully perform both write and read shift
register transfers. It also checks the video signals LHSYNC, LVSYNC, and
LBLANK to verify that they are active and toggling.
64
RGB outputs
Confirms that the analog video signals are correct and it verifies their
functionality.
65
Inten DAC
Verifies that the intensity DAC can be set both low and high.
Chapter 10
10-13
Service Key Menus and Error Messages
Service Key Menus
Test Patterns Test patterns are used in the factory for display adjustments, diagnostics,
and troubleshooting, but they are not used for field service. Test patterns are executed by
entering the test number (66 through 80), then pressing EXECUTE TEST CONTINUE .
The test pattern will be displayed and the softkey labels blanked. To increment to the next
pattern, press softkey 1; to go back to a previous pattern, press softkey 2. To exit the test
pattern and return the softkey labels, press softkey 8 (bottom softkey). The following is a
description of the test patterns.
Table 10-10
Test
Number
66
Test-Patterns
Test Name
Description
Test Pat 1
Displays an all white screen for verifying the light output of the A18 display
and checks for color purity.
Test Pat 2–4
Displays a red, green, and blue pattern for verifying the color purity of the
display and also the ability to independently control each color.
70
Test Pat 5
Displays an all black screen. This is used to check for stuck pixels.
71
Test Pat 6
Displays a 16-step gray scale for verifying that the A19 GSP board can produce
16 different amplitudes of color (in this case, white). The output comes from the
RAM on the GSP board, it is then split. The signal goes through a video DAC
and then to an external monitor or through some buffer amplifiers and then to
the internal LCD display. If the external display looks good but the internal
display is bad, then the problem may be with the display or the cable connecting
it to the GSP board. This pattern is also very useful when using an oscilloscope
for troubleshooting. The staircase pattern it produces will quickly show missing
or stuck data bits.
72
Test Pat 7
Displays the following seven colors: Red, Yellow, Green, Cyan, Blue, Magenta
and White.
73
Test Pat 8
This pattern is intended for use with an external display. The pattern displays a
color rainbow pattern for showing the ability of the A19 GSP board to display 15
colors plus white. The numbers written below each bar indicate the tint number
used to produce that bar (0 &100=pure red, 33=pure green, 67=pure blue).
74
Test Pat 9
Displays the three primary colors Red, Green, and Blue at four different
intensity levels. You should see 16 color bands across the screen. Starting at the
left side of the display the pattern is; Black four bands of Red (each band
increasing in intensity) Black four bands of Green (each band increasing in
intensity) Black four bands of Blue (each band increasing in intensity) Black If
any one of the four bits for each color is missing the display will not look as
described.
75
Test Pat 10
Displays a character set for showing the user all the different types and sizes of
characters available. Three sets of characters are drawn in each of the three
character sizes. 125 characters of each size are displayed. Characters 0 and 3
cannot be drawn and several others are really control characters (such as
carriage return and line feed).
76
Test Pat 11
Displays a bandwidth pattern for verifying the bandwidth of the EXTERNAL
display. It consists of multiple alternating white and black vertical stripes. Each
stripe should be clearly visible. A limited bandwidth would smear these lines
together. This is used to test the quality of the external monitor.
67–69
10-14
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Table 10-10
Test
Number
Test-Patterns
Test Name
Description
77
Test Pat 12
Displays a repeating gray scale for troubleshooting, using an oscilloscope. It is
similar to the 16 step gray scale but is repeated 32 times across the screen.
Each of the 3 outputs of the video palette will then show 32 ramps (instead of
one staircase) between each horizontal sync pulse. This pattern is used to
troubleshoot the pixel processing circuit of the A19 GSP board.
78
Test Pat 13
Displays a convergence pattern for measuring the accuracy of the color
convergence of the external monitor.
Test Pat
14–15
Displays crosshatch and inverse crosshatch patterns for testing color
convergence, linearization alignment. This is useful when aligning the LCD
display in the bezel.
79–80
Chapter 10
10-15
Service Key Menus and Error Messages
Service Key Menus
Service Feature Menus
The service feature menus are shown in Figure 10-2 and described in the following tables.
The following keys access the service feature menus:
•
SERVICE MODES
•
ANALOG BUS on OFF
•
PEEK/POKE
•
FIRMWARE REVISION
Figure 10-2
Service Feature Menus
Service Modes Menu
The service modes menu allows you to control and monitor various circuits for
troubleshooting. To access this menu, press System SERVICE MENU .
10-16
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
SERVICE MODES
Table 10-11
Service Modes Menu Keys
Key
GPIB
Mnemonic
FRACN TUNE on OFF
SM1
Description
Tests the A13 and A14 fractional-N circuits. It allows you to
directly control and monitor the output frequency of the
fractional-N synthesizer (10 MHz to 60 MHz). Set the
instrument to CW sweep mode and then set FRACN TUNE
ON.
Change frequencies with the front panel keys or knob. The
output of the A14 assembly can be checked at A14J1 HI OUT
(in high band) or A14J2 LO OUT (in low band) with an
oscilloscope, a frequency counter, or a spectrum analyzer.
Signal jumps and changes in shape at 20 MHz and 30 MHz
when tuning up in frequency, and at 29.2 MHz and 15 MHz
when tuning down, are due to switching of the digital divider.
This mode can be used with the SRC TUNE mode as
described in Chapter 7 , “Source Troubleshooting.”
SRC ADJUST MENU
N/A
Accesses the functions that allow you to adjust the source:
SRC TUNE on OFF tests the pretune functions of
the phase lock and source assemblies. Use the entry
controls to set test port output to any frequency from
300 kHz to 6 GHz. When in this mode:
— Set analyzer to CW frequency before pressing
SRC TUNE ON .
— Test port output is 1 to 6 MHz above indicated
(entered) frequency.
— Instrument does not attempt to phase lock.
— Residual FM increases.
SRC TUNE FREQ allows you to change the source
tune frequency.
ALC ON off toggles the automatic leveling control
(ALC) on and off.
MAIN PWR DAC
SLOPE DAC
SRC ADJUST DACS
HB FLTR SW on OFF
SOURCE PLL ON off
Chapter 10
SM3
With this mode switched OFF, the source stays in the pretune
mode and does not attempt to complete the phase lock
sequence. Also, all phase lock error messages are disabled.
The fractional-N circuits and the receiver operate normally.
Therefore, the instrument sweeps, but the source is being
driven by the pretune DAC in a stair-stepped fashion.
10-17
Service Key Menus and Error Messages
Service Key Menus
Table 10-11
Service Modes Menu Keys
Key
PLL AUTO ON off
GPIB
Mnemonic
SM4
Description
Automatically attempts to determine new pretune values
when the instrument encounters phase lock problems (for
example, “harmonic skip”). With PLL AUTO OFF , the
frequencies and voltages do not change, like when they are
attempting to determine new pretune values, so
troubleshooting the phase-locked loop circuits is more
convenient. This function may also be turned off to avoid
pretune calibration errors in applications where there is a
limited frequency response in the R (reference) channel. For
example, in a high power test application, using band limited
filters for R channel phase locking.
PLL DIAG on OFF
N/A
Displays a phase lock sequence at the beginning of each band.
This sequence normally occurs very rapidly, making it
difficult to troubleshoot phase lock problems. Switching this
mode ON slows the process down, allowing you to inspect the
steps of the phase lock sequence (pretune, acquire, and track)
by pausing at each step. The steps are indicated on the
display, along with the channel (C1 or C2) and band number
(B1 through B13).
This mode can be used with PLL PAUSE to halt the process
at any step. It can also be used with the analog bus counter.
PLL PAUSE
N/A
Used only with PLL DIAG mode. CONT indicates that it
will continuously cycle through all steps of the phase lock
sequence. PAUSE holds it at any step of interest. This
mode is useful for troubleshooting phase-locked loop
problems.
MORE
N/A
Provides access to the rest of the service modes keys.
SAMPLER COR ON off
SM5
Toggles the sampler correction routine ON, for normal
operation, or OFF, for diagnosis or adjustment purposes.
IF GAIN AUTO
N/A
Normal operating condition and works in conjunction with IF
GAIN ON and OFF. The A10 assembly includes a switchable
attenuator section and an amplifier that amplifies low-level
4 kHz IF signals (for A and B inputs only). This mode allows
the A10 IF section to automatically determine if the
attenuator should be switched in or out. The switch occurs
when the A or B input signal is approximately −30 dBm.
IF GAIN ON
N/A
Locks out the A10 IF attenuator sections for checking the A10
IF gain amplifier circuits, regardless of the amplitude of the
A or B IF signal. Switches out both the A and B attenuation
circuits; they cannot be switched independently. Be aware
that input signal levels above −30 dBm at the sampler input
will saturate the ADC and cause measurement errors.
10-18
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Table 10-11
Service Modes Menu Keys
Key
GPIB
Mnemonic
Description
IF GAIN OFF
N/A
Switches in both of the A10 IF attenuators for checking the
A10 IF gain amplifier circuits. Small input signals will
appear noisy, and raise the apparent noise floor of the
instrument.
SPUR TEST on OFF
SM7
For factory use only.
STORE EEPR on OFF
N/A
Allows you to store the correction constants that reside in
non-volatile memory (EEPROM) onto a disk. Correction
constants improve instrument performance by compensating
for specific operating variations due to hardware limitations
(refer to Chapter 3 , “Adjustments and Correction
Constants”). Having this information on disk is useful as a
backup, in case the constants are lost (due to a CPU board
failure). Without a disk backup the correction constants can
be regenerated manually, although the procedures are more
time consuming.
SPUR AVOID ON off
SM8
Offsets the frequency of both the A3 YIG oscillator and the A3
cavity oscillator to avoid spurs which cannot otherwise be
filtered out. SPUR AVOID OFF allows examination of
these spurs for service.
Chapter 10
10-19
Service Key Menus and Error Messages
Service Key Menus
Analog Bus
To access the analog bus, press System
SERVICE MENU
ANALOG BUS ON .
Description of the Analog Bus The analog bus is a single multiplexed line that
networks 31 nodes within the instrument. It can be controlled from the front panel, or
through GPIB, to make voltage and frequency measurements just like a voltmeter,
oscilloscope, or frequency counter. The next few paragraphs provide general information
about the structure and operation of the analog bus. See “Analog Bus Nodes” on page 10-22
for a description of each individual node. Refer to the “Overall Block Diagram” in Chapter
4 , “Start Troubleshooting Here” to see where the nodes are located in the instrument.
The analog bus consists of a source section and a receiver section. The source can be the
following:
• any one of the 31 nodes described in “Analog Bus Nodes” on page 10-22
• the A14 fractional-N VCO
• the A14 fractional-N VCO divided down to 100 kHz
The receiver portion can be the following:
• the main ADC
• the frequency counter
When analog bus traces are displayed, frequency is the x-axis. For a linear x-axis in time,
switch to CW time mode (or sweep a single band).
The Main ADC The main ADC is located on the A10 digital IF assembly and makes
voltage measurements in two ranges. See “Analog In Menu” on page 10-21 for more
information.
The Frequency Counter The frequency counter is located on the A14 assembly and can
count one of three sources:
• selected analog bus node
• A14 fractional-N VCO (FRAC N)
• A14 fractional-N VCO divided down to 100 kHz (DIV FRAC N) (frequency range is
100 kHz to 16 MHz)
The counts are triggered by the phase lock cycle; one at each pretune, acquire, and track
for each bandswitch. (The service mode, SOURCE PLL, must be ON for the counter to be
updated at each bandswitch). The counter works in swept modes or in CW mode. It can be
used in conjunction with SERVICE MODES for troubleshooting phase lock and source
problems.
To read the counter over GPIB, use the command OUTPCNTR.
Notes
• The display and marker units (U) correspond to volts.
• Nodes 17 (1st IF) and 24 (2nd LO) are unreliable above 1 MHz.
10-20
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
• About 0.750 MHz is a typical counter reading with no AC signal present.
• Anything occurring during bandswitches is not visible.
• Fast-moving waveforms may be sensitive to sweep time.
• The analog bus input impedance is about 50K ohms.
• Waveforms up to approximately 200 Hz can be reproduced.
Analog In Menu
Select this menu to monitor voltage and frequency nodes, using the analog bus and
internal counter, as explained below.
To switch on the analog bus and access the analog in menu, press:
System
SERVICE MENU
ANALOG BUS ON
Meas
ANALOG IN
The RESOLUTION key toggles between low and high resolution.
Resolution
Maximum Signal
Minimum Signal
LOW
+0.5 V
−0.5 V
HIGH
+10 V
−10 V
Table 10-12
Analog In Menu Keys
Key
AUX OUT on OFF
GPIB
Mnemonic
Description
N/A
Allows you to monitor the analog bus nodes (except nodes 1,
2, 3, 4, 9, 10, 12) with external equipment (oscilloscope,
voltmeter, etc.). To do this, connect the equipment to the AUX
INPUT BNC connector on the rear panel, and press
AUX OUT , until ON is highlighted.
CAUTION
COUNTER: OFF
N/A
Switches the internal counter off and removes the counter
display from the display. The counter can be switched on with
one of the next three keys. (Note: Using the counter slows the
sweep.) The counter bandwidth is 16 MHz unless otherwise
noted for a specific node.
NOTE
ANALOG BUS
Chapter 10
N/A
To prevent damage to the analyzer, first
connect the signal to the rear panel AUX
INPUT, and then switch the function ON.
OUTPCNTR is the GPIB command to output the
counter's frequency data.
Switches the counter to monitor the analog bus.
10-21
Service Key Menus and Error Messages
Service Key Menus
Table 10-12
Analog In Menu Keys
Key
GPIB
Mnemonic
Description
FRAC N
N/A
Switches the counter to monitor the A14 fractional-N VCO
frequency at the node shown on the “Overall Block Diagram,”
in Chapter 4 , “Start Troubleshooting Here.”
DIV FRAC N
N/A
Switches the counter to monitor the A14 fractional-N VCO
frequency after it has been divided down to 100 kHz for phase
locking the VCO.
Analog Bus Nodes
The following paragraphs describe the 31 analog bus nodes. The nodes are listed in
numerical order and are grouped by assembly. Refer to the “Overall Block Diagram” in
Chapter 4 , “Start Troubleshooting Here” for node locations.
A3 Source To observe six of the eight A3 analog bus nodes (not node 5 or 8), perform step
A3 to set up a power sweep on the analog bus. Then follow the node specific instructions.
Step A3: Press Preset
ANALOG IN
Format
SWEEP TYPE MENU
10-22
System SERVICE MENU ANALOG BUS ON Meas
MORE REAL Sweep Setup
CW FREQ 3
G/n
POWER SWEEP Start
−15
x1
Stop
10
x1 .
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 1
Mn Pwr DAC (main power DAC)
Perform step A3 to set up a power sweep on the analog bus. Then press Meas
ANALOG IN 1
AUTO SCALE .
x1
Scale Ref
Node 1 is the output of the main power DAC. It sets the reference voltage to the ALC loop.
At normal operation, this node should read approximately −4 volts at 0 dBm with a slope of
about −150 mV/dB. This corresponds to approximately 4 volts from −15 to +10 dBm.
Figure 10-3
Chapter 10
Analog Bus Node 1
10-23
Service Key Menus and Error Messages
Service Key Menus
Node 2
Src 1V/GHz (source 1 volt per GHz)
Press the following to view analog bus node 2:
Preset
Start
30
k/m
System SERVICE MENU ANALOG BUS ON Meas
ANALOG IN 2
AUTO SCALE
x1 Format MORE REAL Scale Ref
Node 2 measures the voltage on the internal voltage controlled oscillator. Or, in normal
operation, it should read −1 V/GHz.
Figure 10-4
10-24
Analog Bus Node 2
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 3
Amp Id (amplifier current)
Press the following keys to view analog node 3:
Preset
Format
System
MORE
SERVICE MENU
REAL
Scale Ref
ANALOG BUS ON
Meas
ANALOG IN
3
x1
AUTO SCALE
Node 3 measures the current that goes to the main IF amplifier. At normal operation this
node should read about:
• 15 mA from 30 kHz to 299 kHz
• 130 mA from 300 kHz to 3 GHz
• 500 mA from 3 GHz to 6 GHz
Figure 10-5
Chapter 10
Analog Bus Node 3
10-25
Service Key Menus and Error Messages
Service Key Menus
Node 4
Det (detects RF OUT power level)
Perform step A3, described previously, to set up a power sweep on the analog bus. Then
AUTO SCALE .
press Meas ANALOG IN 4
x1 Scale Ref
Node 4 detects power that is coupled and detected from the RF OUT arm to the ALC loop.
Note that the voltage exponentially follows the power level inversely. Flat segments
indicate ALC saturation and should not occur between −85 dBm and +10 dBm.
Figure 10-6
Node 5
Analog Bus Node 4
Temp (temperature sensor)
This node registers the temperature of the cavity oscillator which must be known for
effective spur avoidance. The sensitivity is 10 mV/°C. The oscillator changes frequency
slightly as its temperature changes. This sensor indicates the temperature so that the
frequency can be predicted.
10-26
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 6
Integ (ALC leveling integrator output)
Perform step A3 to set up a power sweep on the analog bus. Then press Meas
ANALOG IN 6
AUTO SCALE .
x1 Scale Ref
Node 6 displays the output of the summing circuit in the ALC loop. Absolute voltage level
variations are normal. When node 6 goes above 0 volts, the ALC saturation is indicated.
Figure 10-7
Chapter 10
Analog Bus Node 6
10-27
Service Key Menus and Error Messages
Service Key Menus
Node 7
Log (log amplifier output detector)
Perform step A3 to set up a power sweep on the analog bus. Then press Meas
ANALOG IN 7
AUTO SCALE .
x1 Scale Ref
Node 7 displays the output of a logger circuit in the ALC loop. The trace should be a linear
ramp with a slope of 33 mv/dB with approximately 0 volts at −3 dBm. Absolute voltage
level variations are normal. Flat segments indicate ALC saturation and should not occur
between −15 dBm and +10 dBm.
The proper waveform at node 7 indicates that the circuits in the A3 source ALC loop are
normal and the source is leveled.
Figure 10-8
Node 8
Analog Bus Node 7
A3 Gnd (ground)
A10 Digital IF To observe the A10 analog bus nodes, perform step A10, below. Then
follow the node-specific instructions.
Step A10: Press: Preset
ANALOG BUS ON
10-28
Format
Meas
ANALOG IN
MORE
Marker
System
SERVICE MENU
REAL .
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 9
+0.37 V (+0.37 V reference)
Perform step A10, above, and then press Meas
9
x1 .
ANALOG IN
RESOLUTION [HIGH]
Check for a flat line at approximately +0.37 V. This is used as the voltage reference in
“Analog Bus Correction Constants (Test 46)” on page 3-9. The voltage level should be the
same in high and low resolution; the absolute level is not critical.
Node 10
+2.50 V (+2.50 V reference)
Perform step A10, above, and then press Meas
10
x1
Scale Ref
1
x1 .
ANALOG IN
RESOLUTION [LOW]
Check for a flat line at approximately +2.5 V. This voltage is used in “Analog Bus
Correction Constants (Test 46)” on page 3-9 as a reference for calibrating the analog bus
low resolution circuitry.
Node 11
Aux Input (rear panel input)
Perform step A10 and then press Meas
ANALOG IN
11
x1 .
This selects the rear panel AUX INPUT to drive the analog bus for voltage and frequency
measurements. It can be used to look at test points within the instrument, using the
analyzer's display as an oscilloscope. Connect the test point of interest to the rear panel
AUX INPUT BNC connector.
This feature can be useful if an oscilloscope is not available. Also, it can be used for testing
voltage-controlled devices by connecting the driving voltage of the device under test to the
AUX IN connector. Look at the driving voltage on one display channel, while displaying the
S-parameter response of the test device on the other display channel.
With AUX OUT switched ON, you can examine the analyzer's analog bus nodes with
external equipment (see AUX OUT on OFF in Table 10-12 on page 10-21). For GPIB
considerations, see “GPIB Service Mnemonic Definitions” on page 10-42.
Node 12
A10 Gnd (ground reference)
This node is used in “Analog Bus Correction Constants (Test 46)” on page 3-9 as a reference
for calibrating the analog bus low and high resolution circuitry.
A11 Phase Lock To observe the A11 analog bus nodes, perform step A11, below. Then
follow the node-specific instructions.
Step A11: Press Preset
ANALOG BUS ON
Node 13
Chapter 10
Meas ANALOG IN
Format MORE REAL .
Marker
System
SERVICE MENU
VCO Tune 2 (not used)
10-29
Service Key Menus and Error Messages
Service Key Menus
Node 14
Vbb Ref (ECL reference voltage level)
Perform step A11 and then press Meas
REFERENCE VALUE −1.29 x1 .
ANALOG IN
14
x1
Scale Ref
0.3
x1
The trace should be a flat line across the entire operation frequency range within 0.3 V
(one division) of the reference value. Vbb Ref is used to compensate for ECL voltage drift.
Figure 10-9
10-30
Analog Bus Node 14
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 15
Pretune (open-loop source pretune voltage)
Perform step A11 and then press Meas
AUTO SCALE .
ANALOG IN
15
x1
Scale Ref
This node displays the source pretune signal and should look like a stair-stepped ramp.
Each step corresponds to the start of a band.
Figure 10-10
Chapter 10
Analog Bus Node 15
10-31
Service Key Menus and Error Messages
Service Key Menus
Node 16
1V/GHz (source oscillator tuning voltage)
Perform step A11 and then press Meas
AUTO SCALE .
ANALOG IN
16
x1
Scale Ref
This node displays the tuning voltage ramp used to tune the source oscillator. You should
see a voltage ramp like the one shown in Figure 10-11. If this waveform is correct, you can
be confident that the A11 phase lock assembly, the A3 source assembly, the A13/A14
fractional-N assemblies, and the A7 pulse generator are working correctly and the
instrument is phase locked. If you see anything else, refer to the Chapter 7 , “Source
Troubleshooting.”
Figure 10-11
10-32
Analog Bus Node 16
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 17
1st IF (IF used for phase lock)
Perform step A11 and then press Meas
COUNTER: ANALOG BUS
ANALOG IN
Sweep Setup
17
x1
CW FREQ .
Vary the frequency and compare the results to the table below.
Entered Frequency
Counter Reading
0.2 to 15.999 MHz
same as entered
16 MHz to 3 GHz
1 MHz
This node displays the IF frequency (see Figure 10-12) as it enters the A11 phase lock
assembly via the A4 R sampler assembly. This signal comes from the R sampler output and
is used to phase lock the source.
Figure 10-12
Chapter 10
Counter Readout Location
10-33
Service Key Menus and Error Messages
Service Key Menus
Node 18
IF Det 2N (IF on A11 phase lock after 3 MHz filter)
Perform step A11 and then press Meas
Scale Ref AUTOSCALE .
ANALOG IN
18
x1
Stop
20
M/µ
This node detects the IF within the low pass filter/limiter. The filter is used during the
track and sweep sequences but never in band 1 (3.3 to 16 MHz). The low level (about
−1.7 V) means IF is in the passband of the filter. This node can be used with the FRAC N
TUNE and SRC TUNE service modes.
Figure 10-13
Analog Bus Node 18
Node 19
IF Det 2W (IF after 16 MHz filter)
Perform step A11 and then press Meas
Scale Ref
0.2
x1
ANALOG IN
REFERENCE VALUE
−1.2
19
x1
Stop
20
x1
x1 .
This node detects IF after the 16 MHz filter/limiter. The filter is used during pretune and
acquire, but not in band 1. Normal state is a flat line at about −1.7 V.
10-34
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 20
IF Det 1 (IF after 30 MHz filter)
Perform step A11 and then press Meas
REFERENCE VALUE −1.29
x1 .
ANALOG IN
20
x1
Scale Ref
0.3
x1
The trace should be a flat line across the entire frequency band at least 0.5 V greater than
Vbb (node 14). The correct trace indicates the presence of IF after the first 30 MHz
filter/limiter.
Figure 10-14
Analog Bus Node 20
A12 Reference To observe the A12 analog bus nodes perform step A12, below. Then
follow the node-specific instructions.
Step A12: Press Preset
ANALOG BUS ON
Node 21
Meas ANALOG IN
MORE REAL .
Marker
System
SERVICE MENU
Format
100 kHz (100 kHz reference frequency)
Perform step A12 and then press Meas ANALOG IN 21
x1
COUNTER: ANALOG BUS . This node counts the A12 100 kHz reference signal that is
used on A13 (the fractional-N analog assembly) as a reference frequency for the phase
detector.
Node 22
Chapter 10
A12 Gnd 1 (ground)
10-35
Service Key Menus and Error Messages
Service Key Menus
Node 23
VCO Tune (A12 VCO tuning voltage)
Perform Step A12 and then press Start
ANALOG IN
23
x1
Marker
11
Scale Ref
M/µ
Stop
21
M/µ
Meas
AUTO SCALE .
The trace should show a voltage step as shown in Figure 10-15. At normal operation, the
left half trace should be 0 ±1000 mV and the right half trace should be 100 to 200 mV
higher (that is, one to two divisions). If the trace does not appear as shown in Figure 10-15,
refer to “High/Low Band Transition Adjustment” on page 3-45.
Figure 10-15
10-36
Analog Bus Node 23
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 24
2nd LO
Perform step A12 and then press Meas
COUNTER: ANALOG BUS
ANALOG IN
24
x1
CW FREQ .
Sweep Setup
This node counts the 2nd LO used by the sampler/mixer assemblies to produce the 2nd IF
of 4 kHz. As you vary the frequency, the counter reading should change to values very close
to those indicated below:
Frequency Entered
Counter Reading
0.03 to 1 MHz
(frequency-entered) +4 kHz
1 to 16 MHz
not accurate
16 to 3,000 MHz
996 kHz
Node 25
PL Ref (phase lock reference)
Perform step A12 and then press Meas
COUNTER: ANALOG BUS
ANALOG IN
25
x1
CW FREQ .
Sweep Setup
This node counts the reference signal used by the phase comparator circuit on the A11
phase lock assembly. As you vary the frequency, the counter reading should change as
indicated below:
Frequency Entered
Counter Reading
0.3 to 1 MHz
frequency entered
1 to 16 MHz
not accurate
16 to 3,000 MHz
1 MHz
Node 26
Ext Ref (rear panel external reference input)
Perform step A12 and then press Meas
ANALOG IN
26
x1 .
The voltage level of this node indicates whether an external reference timebase is being
used:
• No external reference: about −0.9 V
• With external reference: about −0.6 V
Chapter 10
10-37
Service Key Menus and Error Messages
Service Key Menus
Node 27
VCXO Tune (40 MHz VCXO tuning voltage)
Perform step A12 and then press Meas
MARKER →REFERENCE .
ANALOG IN
27
x1
Marker Fctn
This node displays the voltage used to fine tune the A12 reference VCXO to 40 MHz. You
should see a flat line at some voltage level (the actual voltage level varies from instrument
to instrument). Anything other than a flat line indicates that the VCXO is tuning to
different frequencies. Refer to “Frequency Accuracy Adjustment” on page 3-42.
Node 28
A12 Gnd 2 (Ground reference)
A14 Fractional-N (Digital) To observe the A14 analog bus nodes perform step A14,
below. Then follow the node-specific instructions.
Step A14: Press Preset
ANALOG BUS ON
Node 29
Meas ANALOG IN
Format MORE REAL .
System
SERVICE MENU
FN VCO Tun (A14 FN VCO tuning voltage)
Perform step A14 and then press Meas
AUTOSCALE .
ANALOG IN
29
x1
Scale Ref
Observe the A14 FN VCO tuning voltage. If the A13 and A14 assemblies are functioning
correctly and the VCO is phase locked, the trace should look like Figure 10-16. Any other
waveform indicates that the FN VCO is not phase locked. The vertical lines in the trace
indicate the band crossings. (The counter can also be enabled to count the VCO frequency
in CW mode.)
Figure 10-16
10-38
Analog Bus Node 29
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Node 30
FN VCO Det (A14 VCO detector)
Perform step A14 and then press Meas
Scale Ref
50
k/m .
ANALOG IN
30
x1
RESOLUTION [HIGH]
See whether the FN VCO is oscillating. The trace should resemble Figure 10-17.
Figure 10-17
Analog Bus Node 30
Node 31
Count Gate (analog bus counter gate)
Perform step A14 and then press Meas
ANALOG IN
31
x1
Scale Ref
2
x1 .
You should see a flat line at +5 V across the operating frequency range. The counter gate
activity occurs during bandswitches, and therefore is not visible on the analog bus. To view
the bandswitch activity, look at this node on an oscilloscope, using AUX OUT ON . Refer to
AUX OUT on OFF in Table 10-12 on page 10-21.
Chapter 10
10-39
Service Key Menus and Error Messages
Service Key Menus
PEEK/POKE Menu
To access this menu, press System
Table 10-13
SERVICE MENU
PEEK/POKE .
PEEK/POKE Menu Keys
Key
PEEK/POKE
GPIB
Mnemonic
N/A
Description
Allows you to edit the content of one or more memory
addresses. The keys are described below.
CAUTION
PEEK/POKE ADDRESS
PEEL[D]
PEEK
PEEK
POKE
POKE[D]
The PEEK/POKE capability is intended for
service use only.
Accesses any memory address and shows it in the active
entry area of the display. Use the front panel knob, entry
keys, or step keys to enter the memory address of interest.
Displays the data at the accessed memory address.
allows you to change the data at the memory address
accessed by the PEEK/POKE ADDRESS softkey. Use
the front panel knob, entry keys, or step keys to change the
data. The A9CC switch must be in the “ALTER” position in
order to poke.
RESET MEMORY
N/A
Resets or clears the memory where instrument states are
stored. To do this, press RESET MEMORY
10-40
Preset .
Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Firmware Revision Softkey
Press System SERVICE MENU FIRMWARE REVISION to display the current
firmware revision information. The number and implementation date appear in the active
entry area of the display as shown in Figure 10-18. The analyzer's serial number and
installed options are also displayed. Another way to display the firmware revision
information is to cycle the line power.
Figure 10-18
Chapter 10
Location of Firmware Revision Information on Display
10-41
Service Key Menus and Error Messages
GPIB Service Mnemonic Definitions
GPIB Service Mnemonic Definitions
All service routine keystrokes can be made through GPIB in one of the following
approaches:
• sending equivalent remote GPIB commands. (Mnemonics have been documented
previously with the corresponding keystroke.)
• invoking the System Menu (MENUSYST) and using the analyzer mnemonic (SOFTn),
where “n” represents the softkey number. (Softkeys are numbered 1 to 8 from top to
bottom.)
GPIB programming information is provided in the analyzer’s programmer’s guide.
Invoking Tests Remotely
Many tests require a response to the displayed prompts. Since bit 1 of the Event Status
Register B is set (bit 1 = service routine waiting) any time a service routine prompts the
user for an expected response, you can send an appropriate response using one of the
following techniques:
• Read event status register B to reset the bit.
• Enable bit 1 to interrupt (ESNB[D]). See “Status Reporting” in the analyzer’s
programmer’s guide.
• Respond to the prompt with a TESRn command (see “Tests Menu” on page 10-4).
Symbol Conventions
[]
An optional operand
D
A numerical operand
<>
A necessary appendage
|
An either/or choice in appendages
10-42
Chapter 10
Service Key Menus and Error Messages
GPIB Service Mnemonic Definitions
Analog Bus Codes
ANAI[D]
Measures and displays the analog input. The preset state input to
the analog bus is the rear panel AUX IN. The other 30 nodes may
be selected with D only if the ABUS is enabled (ANABon).
OUTPCNTR
Outputs the counter's frequency data.
OUTPERRO
Reads any prompt message sent to the error queue by a service
routine.
OUTPTESS
Outputs the integer status of the test most recently executed.
Status codes are those listed under “TST?”.
TST?
Executes the power-on self test (internal test 1) and outputs an
integer test status. Status codes are as follows:
0 =pass
1 =fail
2 =in progress
3 =not available
4 =not done
5 =done
Chapter 10
10-43
Service Key Menus and Error Messages
Error Messages
Error Messages
This section contains an alphabetical list of the error messages that pertain to servicing
the analyzer. The information in the list includes explanations of the displayed messages
and suggestion to help solve the problem.
NOTE
The error messages that pertain to measurement applications are included in
the your analyzer’s reference guide.
BATTERY FAILED. STATE MEMORY CLEARED
Error Number 183
The battery protection of the non-volatile SRAM memory has failed. The SRAM
memory has been cleared. Refer to Chapter 14 , “Assembly Replacement and
Post-Repair Procedures,” for battery replacement instructions. See the chapter
titled “Preset State and Memory Allocation” in the analyzer’s reference guide for more
information about the SRAM memory.
BATTERY LOW! STORE SAVE REGS TO DISK
Error Number 184
The battery protection of the non-volatile SRAM memory is in danger of failing. If this
occurs, all of the instrument state registers stored in SRAM memory will be lost. Save
these states to a disk and refer to Chapter 14 , “Assembly Replacement and
Post-Repair Procedures,” for battery replacement instructions. See the chapter
titled “Preset State and Memory Allocation” in the analyzer’s reference guide for more
information about the SRAM memory.
CALIBRATION ABORTED
Error Number 74
You have changed the active channel during a calibration so the calibration in progress
was terminated. Make sure the appropriate channel is active and restart the
calibration.
CALIBRATION REQUIRED
Error Number 63
A calibration set could not be found that matched the current stimulus state or
measurement parameter. You will have to perform a new calibration.
CORRECTION CONSTANTS NOT STORED
Error Number 3
A store operation to the EEPROM was not successful. You must change the position of
the switch on the A9 CPU assembly. Refer to “A9 Switch Positions” on page 3-6.
CORRECTION TURNED OFF
Error Number 66
10-44
Critical parameters in your current instrument state do not match the parameters for
the calibration set, therefore correction has been turned off. The critical instrument
state parameters are sweep type, start frequency, frequency span, and number of
points.
Chapter 10
Service Key Menus and Error Messages
Error Messages
CURRENT PARAMETER NOT IN CAL SET
Error Number 64
Correction is not valid for your selected measurement parameter. Either change the
measurement parameters or perform a new calibration.
DEADLOCK
Error Number 111
A fatal firmware error occurred before instrument preset completed.
DEVICE: not on, not connect, wrong addrs
Error Number 119
The device at the selected address cannot be accessed by the analyzer. Verify that the
device is switched on, and check the GPIB connection between the analyzer and the
device. Ensure that the device address recognized by the analyzer matches the GPIB
address set on the device itself.
DISK HARDWARE PROBLEM
Error Number 39
The disk drive is not responding correctly. Refer to the disk drive operating manual.
DISK MESSAGE LENGTH ERROR
Error Number 190
The analyzer and the external disk drive aren't communicating properly. Check the
GPIB connection and then try substituting another disk drive to isolate the problem
instrument.
DISK: not on, not connected, wrong addrs
Error Number 38
The disk cannot be accessed by the analyzer. Verify power to the disk drive, and check
the GPIB connection between the analyzer and the disk drive. Ensure that the disk
drive address recognized by the analyzer matches the GPIB address set on the disk
drive itself.
DISK READ/WRITE ERROR
Error Number 189
There may be a problem with your disk. Try a new floppy disk. If a new floppy disk
does not eliminate the error, suspect hardware problems.
INITIALIZATION FAILED
Error Number 47
The disk initialization failed, probably because the disk is damaged.
INSUFFICIENT MEMORY, PWR MTR CAL OFF
Error Number 154
There is not enough memory space for the power meter calibration array. Increase the
available memory by clearing one or more save/recall registers, or by reducing the
number of points.
NO CALIBRATION CURRENTLY IN PROGRESS
Error Number 69
Chapter 10
The RESUME CAL SEQUENCE softkey is not valid unless a calibration is
already in progress. Start a new calibration.
10-45
Service Key Menus and Error Messages
Error Messages
NO FILE(S) FOUND ON DISK
Error Number 45
No files of the type created by an analyzer store operation were found on the disk. If
you requested a specific file title, that file was not found on the disk.
NO IF FOUND: CHECK R INPUT LEVEL
Error Number 5
The first IF signal was not detected during pretune. Check the front panel R channel
jumper. If there is no visible problem with the jumper, refer to Chapter 7 , “Source
Troubleshooting.”
NO PHASE LOCK: CHECK R INPUT LEVEL
Error Number 7
The first IF signal was detected at pretune, but phase lock could not be acquired. Refer
to Chapter 7 , “Source Troubleshooting.”
NO SPACE FOR NEW CAL. CLEAR REGISTERS
Error Number 70
You cannot store a calibration set due to insufficient memory. You can free more
memory by clearing a saved instrument state from an internal register (which may
also delete an associated calibration set, if all the instrument states using the
calibration kit have been deleted). You can store the saved instrument state and
calibration set to a disk before clearing them. After deleting the instrument states,
press Preset
to run the memory packer.
NOT ALLOWED DURING POWER METER CAL
Error Number 198
When the analyzer is performing a power meter calibration, the GPIB bus is
unavailable for other functions such as printing or plotting.
NOT ENOUGH SPACE ON DISK FOR STORE
Error Number 44
The store operation will overflow the available disk space. Insert a new disk or purge
files to create free disk space.
OVERLOAD ON INPUT A, POWER REDUCED
Error Number 58
See error number 57.
OVERLOAD ON INPUT B, POWER REDUCED
Error Number 59
See error number 57.
OVERLOAD ON INPUT R, POWER REDUCED
Error Number 57
You have exceeded approximately +14 dBm at one of the test ports. The RF output
power is automatically reduced to −85 dBm. The annotation P⇓ appears in the left
margin of the display to indicate that the power trip function has been activated.
When this occurs, reset the power to a lower level, then toggle the
SOURCE PWR on OFF softkey to switch on the power again.
10-46
Chapter 10
Service Key Menus and Error Messages
Error Messages
PARALLEL PORT NOT AVAILABLE FOR GPIO
Error Number 165
You have defined the parallel port as COPY for sequencing in the GPIB menu. To
access the parallel port for general purpose I/O (GPIO), set the selection to [GPIO].
PARALLEL PORT NOT AVAILABLE FOR COPY
Error Number 167
You have defined the parallel port as general purpose I/O (GPIO) for sequencing. The
definition was made under the Local
key menus. To access the parallel port for
copy, set the selection to PARALLEL [COPY] .
PHASE LOCK CAL FAILED
Error Number 4
An internal phase lock calibration routine is automatically executed at power-on,
preset, and any time a loss of phase lock is detected. This message indicates that phase
lock calibration was initiated and the first IF detected, but a problem prevented the
calibration from completing successfully. Refer to Chapter 3 , “Adjustments and
Correction Constants,” and execute pretune correction (test 48). This message may
appear if you connect a mixer between the RF output and R input before turning on
frequency offset mode. Ignore it: it will go away when you turn on frequency offset.
This message may also appear if you turn on frequency offset mode before you define
the offset.
PHASE LOCK LOST
Error Number 8
Phase lock was acquired but then lost. Refer to Chapter 7 , “Source
Troubleshooting.”
POSSIBLE FALSE LOCK
Error Number 6
Phase lock has been achieved, but the source may be phase-locked to the wrong
harmonic of the synthesizer. Perform “Source Pretune Correction Constants (Test
48)” on page 3-10.
POWER METER INVALID
Error Number 116
The power meter indicates an out-of-range condition. Check the test setup.
POWER METER NOT SETTLED
Error Number 118
Sequential power meter readings are not consistent. Verify that the equipment is set
up correctly. If so, preset the instrument and restart the operation.
POWER SUPPLY HOT!
Error Number 21
Chapter 10
The temperature sensors on the A8 post-regulator assembly have detected an
over-temperature condition. The power supplies regulated on the post-regulator have
been shut down. Refer to Chapter 7 , “Source Troubleshooting.”
10-47
Service Key Menus and Error Messages
Error Messages
POWER SUPPLY SHUT DOWN!
Error Number 22
One or more supplies on the A8 post-regulator assembly have been shut down due to
an over-current, over-voltage, or under-voltage condition. Refer to Chapter 5 ,
“Power Supply Troubleshooting.”
POWER UNLEVELED
Error Number 179
There is either a hardware failure in the source or you have attempted to set the power
level too high. Check to see if the power level you set is within specifications. If it is,
refer to Chapter 7 , “Source Troubleshooting.” You will only receive this message
over the GPIB. On the analyzer, P? is displayed.
PRINTER: error
Error Number 175
The parallel port printer is malfunctioning. The analyzer cannot complete the copy
function.
PRINTER: not handshaking
Error Number 177
The printer at the parallel port is not responding.
PRINTER: not on, not connected, wrong addrs
Error Number 24
The printer does not respond to control. Verify power to the printer, and check the
GPIB connection between the analyzer and the printer. Ensure that the printer
address recognized by the analyzer matches the GPIB address set on the printer itself.
PROBE POWER SHUT DOWN!
Error Number 23
The analyzer biasing supplies to the HP/Agilent 85024A external probe are shut down
due to excessive current. Troubleshoot the probe, and refer to Chapter 5 , “Power
Supply Troubleshooting.”
PWR MTR: NOT ON/CONNECTED OR WRONG ADDRS
Error Number 117
The power meter cannot be accessed by the analyzer. Verify that the power meter
address and model number set in the analyzer match the address and model number
of the actual power meter.
SAVE FAILED.INSUFFICIENT MEMORY
Error Number 151
You cannot store an instrument state in an internal register due to insufficient
memory. Increase the available memory by clearing one or more save/recall registers
and pressing Preset , or by storing files to a disk.
SELF TEST #n FAILED
Service Error
Number 112
10-48
Internal test #n has failed. Several internal test routines are executed at instrument
preset. The analyzer reports the first failure detected. Refer to the internal tests and
the self-diagnose feature descriptions earlier in this chapter.
Chapter 10
Service Key Menus and Error Messages
Error Messages
SOURCE POWER TURNED OFF, RESET UNDER POWER MENU
Information
Message
You have exceeded the maximum power level at one of the inputs and power has been
automatically reduced. The annotation P⇓ indicates that power trip has been
activated. When this occurs, reset the power and then press Power
SOURCE PWR on OFF , to switch on the power. This message follows error
numbers 57, 58, and 59.
SWEEP MODE CHANGED TO CW TIME SWEEP
Error Number 187
If you select external source auto or manual instrument mode and you do not also
select CW mode, the analyzer is automatically switched to CW.
TEST ABORTED
Error Number 113
You have prematurely stopped a service test.
TROUBLE!CHECK SETUP AND START OVER
Service Error
Number 115
Your equipment setup for the adjustment procedure in progress is not correct. Check
the setup diagram and instructions in “Source Pretune Correction Constants
(Test 48)” on page 3-10. Start the procedure again.
WRONG DISK FORMAT, INITIALIZE DISK
Error Number 77
Chapter 10
You have attempted to store, load, or read file titles, but your disk format does not
conform to the Logical Interchange Format (LIF). You must initialize the disk before
reading or writing to it.
10-49
Service Key Menus and Error Messages
Error Messages
10-50
Chapter 10
11 Error Terms
11-1
Error Terms
Error Terms
Error Terms
The analyzer generates and stores factors in internal arrays when a measurement
error-correction (measurement calibration) is performed. These factors are known by the
following terms:
• error terms
• E-terms
• measurement calibration coefficients
The analyzer creates error terms by measuring well-defined calibration devices over the
frequency range of interest and comparing the measured data with the ideal model for the
devices. The differences represent systematic (repeatable) errors of the analyzer system.
The resulting calibration coefficients are good representations of the systematic error
sources. For details on the various levels of error-correction, refer to the “Optimizing
Measurement Results” chapter of your analyzer’s user’s guide. For details on the theory of
error-correction, refer to the “Operating Concepts” chapter of your analyzer’s user’s guide.
11-2
Chapter 11
Error Terms
Error Terms Can Serve a Diagnostic Purpose
Error Terms Can Serve a Diagnostic Purpose
Specific parts of the analyzer and its accessories directly contribute to the magnitude and
shape of the error terms. Since we know this correlation and we know what typical error
terms look like, we can examine error terms to monitor system performance (preventive
maintenance) or to identify faulty components in the system (troubleshooting).
• Preventive Maintenance: A stable, repeatable system should generate repeatable
error terms over long time intervals, for example, six months. If you make a hardcopy
record (print or plot) of the error terms, you can periodically compare current error
terms with the record. A sudden shift in error terms reflects a sudden shift in
systematic errors, and may indicate the need for further troubleshooting. A long-term
trend often reflects drift, connector and cable wear, or gradual degradation, indicating
the need for further investigation and preventive maintenance. Yet, the system may
still conform to specifications. The cure is often as simple as cleaning and gaging
connectors or inspecting cables.
• Troubleshooting: If a subtle failure or mild performance problem is suspected, the
magnitude of the error terms should be compared against values generated previously
with the same instrument and calibration kit. This comparison will produce the most
precise view of the problem. If the magnitude exceeds its limit, inspect the
corresponding system component. If the condition causes system verification to fail,
replace the component.
Consider the following while troubleshooting:
— All parts of the system, including cables and calibration devices, can contribute to
systematic errors and impact the error terms.
— Connectors must be clean, gaged, and within specification for error term analysis to
be meaningful.
— Avoid unnecessary bending and flexing of the cables following measurement
calibration, minimizing cable instability errors.
— Use good connection techniques during the measurement calibration. The connector
interface must be repeatable. Refer to Table 1-2 on page 1-5 for information on
connection techniques and on cleaning and gaging connectors.
— Use error term analysis to troubleshoot minor, subtle performance problems. Refer to
Chapter 4 , “Start Troubleshooting Here,” if a blatant failure or gross measurement
error is evident.
— It is often worthwhile to perform the procedure twice (using two distinct
measurement calibrations) to establish the degree of repeatability. If the results do
not seem repeatable, check all connectors and cables.
Chapter 11
11-3
Error Terms
Full Two-Port Error-Correction Procedure
Full Two-Port Error-Correction Procedure
NOTE
This is the most accurate error-correction procedure for the
analyzer. Since the analyzer takes both forward and reverse sweeps, this
procedure takes more time than the other correction procedures.
1. Set any measurement parameters that you want for the device measurement: power,
format, number of points, IF bandwidth.
2. To access the measurement correction menus, press Cal .
3. Press CAL KIT SELECT CAL KIT 7 mm 85031
RETURN .
4. To select the correction type, press:
CALIBRATE MENU
FULL 2-PORT
REFLECTION
5. Connect a shielded open circuit to PORT 1.
Figure 11-1
Standard Connections for Full Two-Port Error-Correction
6. To measure the standard, when the displayed trace has settled, press
FORWARD: OPEN .
The analyzer underlines the OPEN softkey after it measures the standard.
7. Disconnect the open, and connect a short circuit to PORT 1.
8. To measure the device, when the displayed trace has settled, press
FORWARD: SHORT .
The analyzer underlines the SHORT softkey after it measures the standard.
11-4
Chapter 11
Error Terms
Full Two-Port Error-Correction Procedure
9. Disconnect the short, and connect an impedance-matched load to PORT 1.
10.To measure the standard, when the displayed trace has settled, press
FORWARD: LOAD .
The analyzer underlines the LOAD softkey after it measures the standard.
11.Repeat the open-short-load measurements descried above, but connect the devices in
turn to PORT 2, and use the REVERSE: OPEN , REVERSE: SHORT , and
REVERSE: LOAD softkeys.
12.To compute the reflection correction coefficients, press STANDARDS DONE .
13.To start the transmission portion of the correction, press TRANSMISSION .
14.Make a “through” connection between the points where you will connect your device
under test as shown in Figure 11-1.
NOTE
Include any adapters or cables that you will have in the device measurement.
That is, connect the standard device where you will connect your device under
test.
NOTE
The through in most calibration kits is defined with zero length. The
correction will not work properly if a non-zero length through is used, unless
the calibration kit is modified to change the defined through to the length
used. This is important for measurements of non-insertable devices (devices
having ports that are both male or both female). The modified calibration kit
must be saved as the user calibration kit, and USER KIT must be selected
before the calibration is started.
15.To measure the standard, when the trace has settled, press DO BOTH FWD+REV .
The analyzer underlines the softkey label after it makes each measurement.
16.Press ISOLATION and select from the following two options:
• If you will be measuring devices with a dynamic range less than 90 dB, press:
OMIT ISOLATION
ISOLATION DONE .
• If you will be measuring devices with a dynamic range greater than 90 dB, follow
these steps:
a. Connect impedance-matched loads to PORT 1 and PORT 2.
If you will be measuring highly reflective devices, such as filters, use the test
device, connected to the reference plane and terminated with a load, for the
isolation standard.
NOTE
b. Activate at least four times more averages than desired during the device
measurement.
Chapter 11
11-5
Error Terms
Full Two-Port Error-Correction Procedure
c. Press Cal
RESUME CAL SEQUENCE FWD ISOL'N ISOL'N STD
REV ISOL'N ISOL'N STD ISOLATION DONE .
d. Return the averaging to the original state of the measurement, and press Cal
RESUME CAL SEQUENCE .
17.To compute the error coefficients, press DONE 2-PORT CAL .
The analyzer displays the corrected measurement trace. The analyzer also shows the
notation Cor at the left of the screen, indicating that error-correction is on.
NOTE
You can save or store the measurement correction to use for later
measurements. Use the menus under Save/Recall , or refer to your analyzer’s
user’s guide for procedures.
18.This completes the full two-port correction procedure. You can connect and measure
your device under test.
11-6
Chapter 11
Error Terms
Full Two-Port Error-Correction Procedure
Table 11-1
Calibration Coefficient Terms and Tests
Calibration
Coefficient
Calibration Type
Response
1-port
2-portb
EX (ED)
ED
EDF
32
ET (ER)
ES
ESF
33
ER
ERF
34
4
EXF
35
5
ELF
36
6
ETF
37
7
EDR
38
8
ESR
39
9
ERR
40
10
EXR
41
11
ELR
42
12
ETR
43
1
ER or ET
Response and
Isolationa
Test Number
2
3
a. Response and Isolation cal yields: EX or ET if a transmission parameter (S21, S12) or ED or
ER if a reflection parameter (S11, S22).
b. One-path, 2-port cal duplicates arrays 1 to 6 in arrays 7 to 12.
Meaning of first subscript:
Meaning of second subscript:
D: directivity
F: forward
S: source match
R: reverse
R: reflection tracking
X: crosstalk or isolation
L: load match
T: transmission tracking
Chapter 11
11-7
Error Terms
Full Two-Port Error-Correction Procedure
Error Term Inspection
NOTE
If the correction is not active, press Cal
1. Press System
SERVICE MENU
TESTS
32
CORRECTION ON .
x1
EXECUTE TEST .
The analyzer copies the first calibration measurement trace for the selected error term
into memory and then displays it. Table 11-1 lists the test numbers.
2. Press Scale Ref
and adjust the scale and reference to study the error term trace.
3. Press Marker Fctn and use the marker functions to determine the error term
magnitude.
4. Compare the displayed measurement trace to the traces shown in “Error Term
Descriptions” on page 11-9, and to previously measured data.
5. Make a hardcopy of the measurement results:
a. Connect a printing or plotting peripheral to the analyzer.
b. Press Local SYSTEM CONTROLLER SET ADDRESSES and select the
appropriate peripheral to verify that the GPIB address is set correctly on the
analyzer.
c. Press Save/Recall and then choose either PRINT or PLOT .
d. Press Display
later.
MORE
TITLE and title each data trace so that you can identify it
For detailed information on creating hardcopies, refer to your analyzer’s user’s guide.
11-8
Chapter 11
Error Terms
Full Two-Port Error-Correction Procedure
Error Term Descriptions
The error term descriptions in this section include the following information:
• significance of each error term
• typical results following a full 2-port error-correction
• guidelines to interpret each error term
The same description applies to both the forward (F) and reverse (R) terms.
Directivity (EDF and EDR)
Description Directivity is a measure of any detected power that is reflected when a load
is attached to the test port. These are the uncorrected forward and reverse directivity error
terms of the system. The directivity error of the test port is determined by measuring the
reflection (S11, S22) of the load during the error-correction procedure.
Significant System Components
• load used in the error-correction (calibration)
• test port connectors
• test port cables
Affected Measurements
Low reflection device measurements are most affected by directivity errors.
Figure 11-2
Chapter 11
Typical EDF/EDR without and with Cables
11-9
Error Terms
Full Two-Port Error-Correction Procedure
Source Match (ESF and ESR)
Description Source match is a measure of test port connector match, as well as the
match between all components from the source to the test port. These are the forward and
reverse uncorrected source match terms of the driven port.
Significant System Components
• load calibration kit device
• open calibration kit device
• short calibration kit device
• bridge
• test port connectors
• bias tees
• step attenuator
• transfer switch
• test port cables
Affected Measurements Reflection and transmission measurements of highly
reflective devices are most affected by source match errors.
Figure 11-3
11-10
Typical ESF/ESR without and with Cables
Chapter 11
Error Terms
Full Two-Port Error-Correction Procedure
Reflection Tracking (ERF and ERR)
Description Reflection tracking is the difference between the frequency response of the
reference path (R path) and the frequency response of the reflection test path (A or B input
path).
Significant System Components
• open calibration kit device
• short calibration kit device
• R signal path if large variation in both ERF and ERR
• A or B input paths if only one term is affected
Affected Measurements All reflection measurements (high or low return loss) are
affected by the reflection tracking errors.
Figure 11-4
Chapter 11
Typical ERF/ERR without and with Cables
11-11
Error Terms
Full Two-Port Error-Correction Procedure
Isolation (Crosstalk, EXF and EXR)
Description Isolation is a measure of the leakage between the test ports and the signal
paths. The isolation error terms are characterized by measuring transmission (S21, S12)
with loads attached to both ports during the error-correction procedure. Since these terms
are low in magnitude, they are usually noisy (not very repeatable). The error term
magnitude changes dramatically with IF bandwidth: a 10 Hz IF bandwidth must be used
in order to lower the noise floor beyond the crosstalk specification. Using averaging will
also reduce the peak-to-peak noise in this error term.
Significant System Components
• sampler crosstalk
Affected Measurements Transmission measurements, (primarily where the measured
signal level is very low), are affected by isolation errors. For example, transmission
measurements where the insertion loss of the device under test is large.
Figure 11-5
11-12
Typical EXF/EXR with 10 Hz Bandwidth and with 3 kHz Bandwidth
Chapter 11
Error Terms
Full Two-Port Error-Correction Procedure
Load Match (ELF and ELR)
Description Load match is a measure of the impedance match of the test port that
terminates the output of a 2-port device. Load match error terms are characterized by
measuring the reflection (S11, S22) responses of a “through” configuration during the
calibration procedure.
Significant System Components
• “through” cable
• cable connectors
• test port connectors
Affected Measurements All transmission and reflection measurements of a low
insertion loss two-port devices are most affected by load match errors. Transmission
measurements of lossy devices are also affected.
Figure 11-6
Chapter 11
Typical ELF/ELR
11-13
Error Terms
Full Two-Port Error-Correction Procedure
Transmission Tracking (ETF and ETR)
Description Transmission tracking is the difference between the frequency response of
the reference path (including R input) and the transmission test path (including A or B
input) while measuring transmission. The response of the test port cables is included.
These terms are characterized by measuring the transmission (S21, S12) of the “through”
configuration during the error-correction procedure.
Significant System Components
• R signal path (if both ETF and ETR are bad)
• A or B input paths
• “through” cable
Affected Measurements All transmission measurements are affected by transmission
tracking errors.
Figure 11-7
11-14
Typical ETF/ETR
Chapter 11
12 Theory of Operation
12-1
Theory of Operation
This chapter is divided into two major sections:
• “How the Analyzer Works” gives a general description of the network analyzer
operation.
• “A Close Look at the Analyzer's Functional Groups” provides more detailed operating
theory for each of the analyzer's functional groups.
12-2
Chapter 12
Theory of Operation
How the Analyzer Works
How the Analyzer Works
Network analyzers measure the reflection and transmission characteristics of devices and
networks. A network analyzer test system consists of the following:
• source
• signal-separation devices
• receiver
• display
The analyzer applies a signal that is either transmitted through the device under test, or
reflected from its input, and then compares it with the incident signal generated by the
swept RF source. The signals are then applied to a receiver for measurement, signal
processing, and display.
The analyzer integrates a high-resolution synthesized RF source and a dual channel
three-input receiver to measure and display magnitude, phase, and group delay of
transmitted and reflected power. Analyzers with Option 010 have the additional capability
of transforming measured data from the frequency domain to the time domain. Figure 12-1
is a simplified block diagram of the network analyzer system. A detailed block diagram of
the analyzer is located at the end of Chapter 4 , “Start Troubleshooting Here.”
Figure 12-1
Simplified Block Diagram of the Network Analyzer System
The Built-In Synthesized Source
The analyzer's built-in synthesized source produces a swept RF signal in the range of
30 kHz to 3.0 GHz. Analyzers with Option 006 have an extended frequency range of up to
6 GHz. The source output power is leveled by an internal ALC (automatic leveling control)
circuit. To achieve frequency accuracy and phase measuring capability, the analyzer is
phase locked to a highly stable crystal oscillator.
For this purpose, a portion of the transmitted signal is routed to the R channel input of the
receiver, where it is sampled by the phase detection loop and fed back to the source.
Chapter 12
12-3
Theory of Operation
How the Analyzer Works
Test Sets
Signal separation for the analyzer can be accomplished using any one of the following
HP/Agilent accessories:
• 85044A/B Transmission/Reflection Test Set
• 85046A/B S-Parameter Test Set
• 85047A S-Parameter Test Set
• HP/Agilent Made Special Option Transmission/Reflection or S-Parameter Test Set
• 86205A/86207A RF Bridge
• 11667A Two-Way Power Splitter and 86205A RF Bridge
Signal separation devices are needed to separate the incident signal from the
transmitted/reflected signal. The incident signal, which comes from the analyzer's source
RF output, is applied to the R channel receiver input. Meanwhile, the
transmitted/reflected signal is applied to the A or B channel receiver input via a test port
coupler (in a test set) or an RF bridge.
The HP/Agilent 85046A/B and 85047A S-parameter test sets contain the hardware
required to make simultaneous transmission and reflection measurements in both the
forward and reverse directions. An RF path switch in the test set allows reverse
measurements to be made without changing the connections to the device under test.
Test Set Step Attenuator
The 70 dB step attenuator contained in the test set is used to adjust the power level to the
DUT without changing the level of the incident power in the reference path. The
attenuator in the 85046A/B or 85047A test set is controlled from the front panel of the
analyzer using the ATTENUATOR PORT 1 or ATTENUATOR PORT 2 softkeys located
in the power menu.
The Receiver Block
The receiver block contains three sampler/mixers for the R, A and B inputs. The signals
are sampled, and down-converted to produce a 4 kHz IF (intermediate frequency). A
multiplexer sequentially directs each of the three IF signals to the ADC (analog to digital
converter) where it is converted from an analog to a digital signal to be measured and
processed for viewing on the display. Both amplitude and phase information are measured
simultaneously, regardless of what is displayed on the analyzer.
The Microprocessor
A microprocessor takes the raw data and performs all the required error correction, trace
math, formatting, scaling, averaging, and marker operations, according to the instructions
from the front panel or over GPIB. The formatted data is then displayed.
Required Peripheral Equipment
In addition to the analyzer, a system requires calibration standards for vector accuracy
enhancement, and cables for interconnections.
12-4
Chapter 12
Theory of Operation
A Close Look at the Analyzer's Functional Groups
A Close Look at the Analyzer's Functional Groups
The operation of the analyzer is most logically described in five functional groups. Each
group consists of several major assemblies, and performs a distinct function in the
instrument. Some assemblies are related to more than one group, and in fact all the groups
are to some extent interrelated and affect each other's performance.
• Power Supply: The power supply functional group consists of the A8 post regulator
and the A15 preregulator. It supplies power to the other assemblies in the instrument.
• Digital Control: The digital control group consists of the A1 front panel and A2 front
panel processor, the A9 CPU, the A16 rear panel, the A18 display and the A19 graphics
system processor (GSP). The A10 digital IF assembly is also related to this group. These
assemblies combine to provide digital control for the analyzer (and an 85047A or
85046A/B S-parameter test set, if used).
• Source: The source group consists of the A3 source, A7 pulse generator, A11 phase lock,
A12 reference, A13 fractional-N (analog), and A14 fractional-N (digital) assemblies. The
A4 sampler is also related since it is part of the source phase lock loop. The source
supplies a phase-locked RF signal to the device under test.
• Signal Separation: The signal separation group performs the function of an
S-parameter test set, dividing the source signal into a reference path and a test path,
and providing connections to the device under test. It consists of the A24 transfer
switch, the A21 test port 1 coupler, and the A22 test port 2 coupler.
• Signal Separation: The signal separation group divides the source signal into a
reference path and a test path, and provides connections to the device under test. To
accomplish this, one of several external test sets must be connected to the analyzer.
• Receiver: The receiver group consists of the A4/A5/A6 sampler/mixers and the A10
digital IF. The A12 reference assembly and the A9 CPU are also related. The receiver
measures and processes input signals for display.
The following pages describe the operation of each of the functional groups.
Chapter 12
12-5
Theory of Operation
Power Supply Theory
Power Supply Theory
The power supply functional group consists of the A15 preregulator and the A8 post
regulator. These two assemblies comprise a switching power supply that provides
regulated DC voltages to power all assemblies in the analyzer. The A15 preregulator is
enclosed in a casting at the rear of the instrument behind the display. It is connected to the
A8 post regulator by a wire bus A15W1. Figure 12-2 is a simplified block diagram of the
power supply group.
Figure 12-2
Power Supply Functional Group, Simplified Block Diagram
A15 Preregulator
The A15 preregulator steps down and rectifies the line voltage. It provides a fully
regulated +5 V digital supply, and several preregulated voltages that go to the A8 post
regulator assembly for additional regulation.
The A15 preregulator assembly includes the line power module, a 60 kHz switching
preregulator, and overvoltage protection for the +5 V digital supply. It provides LEDs,
visible from the rear of the instrument, to indicate either normal or shutdown status.
Line Power Module
The line power module includes the line power switch, voltage selector switch, and main
fuse. The line power switch is activated from the front panel. The voltage selector switch,
accessible at the rear panel, adapts the analyzer to local line voltages of approximately
115 V or 230 V (with 350 VA maximum). The main fuse, which protects the input side of
the preregulator against drawing too much line current, is also accessible at the rear
panel. Refer to your analyzer’s Installation and Quick Start Guide for line voltage
tolerances and other power considerations.
12-6
Chapter 12
Theory of Operation
Power Supply Theory
Preregulated Voltages
The switching preregulator converts the line voltage to several DC voltages. The regulated
+5 V digital supply goes directly to the motherboard. The following partially regulated
voltages are routed through A15W1 to the A8 post regulator for final regulation:
+70 V (not used)
+25 V
+18 V
−18 V
+8 V
−8 V
Regulated +5 V Digital Supply
The +5 VD supply is regulated by the control circuitry in the A15 preregulator. It goes
directly to the motherboard, and from there to all assemblies requiring a low noise digital
supply. A +5 V sense line returns from the motherboard to the A15 preregulator. The +5 V
CPU is derived from the +5 VD in the A8 post regulator and goes directly to the A19
graphics system processor.
In order for the preregulator to function, the +5 V digital supply must be loaded by one or
more assemblies, and the +5 V sense line must be working. If not, the other preregulated
voltages will not be correct.
Shutdown Indications: the Green LED and Red LED
The green LED is on in normal operation. It is off when line power is not connected, not
switched on, or set too low, or if the line fuse has blown.
The red LED, which is off in normal operation, lights to indicate a fault in the +5 V supply.
This may be an over/under line voltage, over line current, or overtemperature condition.
Refer to the troubleshooting chapters for more information.
A8 Post Regulator
The A8 post regulator filters and regulates the DC voltages received from the A15
preregulator. It provides fusing and shutdown circuitry for individual voltage supplies. It
distributes regulated constant voltages to individual assemblies throughout the
instrument. It includes the overtemperature shutdown circuit, the variable fan speed
circuit, and the air flow detector. Nine green LEDs provide status indications for the
individual voltage supplies.
Refer to the power supply block diagram located at the end of Chapter 5 , “Power Supply
Troubleshooting,” to see the voltages provided by the A8 post regulator.
Voltage Indications: the Green LEDs
The nine green LEDs along the top edge of the A8 assembly are on in normal operation, to
indicate the correct voltage is present in each supply. If they are off or flashing, a problem
is indicated. The troubleshooting procedures later in this chapter detail the steps to trace
the cause of the problem.
Chapter 12
12-7
Theory of Operation
Power Supply Theory
Shutdown Circuit
The shutdown circuit is triggered by overcurrent, overvoltage, undervoltage, or
overtemperature. It protects the instrument by causing the regulated voltage supplies to
be shut down. It also sends status messages to the A9 CPU to trigger warning messages on
the analyzer display. The voltages that are not shut down are the +5 VD and +5 VCPU
digital supplies from the preregulator, the fan supplies, the probe power supplies, and the
display supplies. The shutdown circuit can be disabled momentarily for troubleshooting
purposes by using a jumper to connect the SDIS line (A8TP4) to ground.
Variable Fan Circuit and Air Flow Detector
The fan power is derived directly from the +18 V and −18 V supplies from the A15
preregulator. The fan is not fused, so that it will continue to provide airflow and cooling
when the instrument is otherwise disabled. If overheating occurs, the main instrument
supplies are shut down and the fan runs at full speed. An overtemperature status message
is sent to the A9 CPU to initiate a warning message on the analyzer display. The fan also
runs at full speed if the air flow detector senses a low output of air from the fan. (Full
speed is normal at initial power on.)
Display Power
The A8 assembly supplies +5 VCPU to the A19 GSP through the motherboard. The GSP
converts a portion of the +5 VCPU to 3.3 V to drive the display and LVDS (low voltage
differential signaling) logic. The A19 GSP also controls and supplies power to the A27
backlight inverter. The voltages generated by the inverter are then routed to the display.
Display power is not connected to the protective shutdown circuitry so that the A18 display
assemblies can operate during troubleshooting when other supplies do not work.
NOTE
If blanking pulses from the A19 GSP are not present, then +3.3 V will
not be sent to the display.
Probe Power
The +18 V and −18 V supplies are post regulated to +15 V and −12.6 V to provide a power
source at the front panel for an external RF probe or millimeter module.
12-8
Chapter 12
Theory of Operation
Digital Control Theory
Digital Control Theory
The digital control functional group consists of the following assemblies:
• A1 front panel
• A2 front panel processor
• A9 CPU
• A10 digital IF
• A16 rear panel
• A18 display
• A19 GSP
• A27 Inverter
These assemblies combine to provide digital control for the entire analyzer and the 85047A
or 85046A/B S-parameter test set. They provide math processing functions, as well as
communications between the analyzer and an external controller and/or peripherals.
Figure 12-3 is a simplified block diagram of the digital control functional group.
Chapter 12
12-9
Theory of Operation
Digital Control Theory
Figure 12-3
12-10
Digital Control Group, Simplified Block Diagram
Chapter 12
Theory of Operation
Digital Control Theory
A1 Front Panel
The A1 front panel assembly provides user interface with the analyzer. It includes the
keyboard for local user inputs, and the front panel LEDs that indicate instrument status.
The front panel knob is not electrically connected to the front panel, but provides user
inputs directly to the front panel processor.
A2 Front Panel Processor
The A2 front panel processor detects and decodes user inputs from the front panel and the
RPG, and transmits them to the CPU. It has the capability to interrupt the CPU to provide
information updates. It controls the front panel LEDs that provide status information to
the user.
The A2 also contains the LVDS (low voltage differential signaling) receivers which connect
to the graphics processor. The received video signals are routed to the A18 display.
A9 CPU/A10 Digital IF
The A9 CPU assembly contains the main CPU (central processing unit), the digital signal
processor, memory storage, and interconnect port interfaces. The main CPU is the master
controller for the analyzer, including the other dedicated microprocessors. The memory
includes EEPROM, DRAM, flash ROM, SRAM and boot ROM.
Data from the receiver is serially clocked into the A9 CPU assembly from the A10 digital
IF. The data taking sequence is triggered either from the A14 fractional-N assembly,
externally from the rear panel, or by software on the A9 assembly.
Main CPU
The main CPU is a 32-bit microprocessor that maintains digital control over the entire
instrument through the instrument bus. The main CPU receives external control
information from the front panel or GPIB, and performs processing and formatting
operations on the raw data in the main RAM. It controls the digital signal processor, the
front panel processor, the display processor, and the interconnect port interfaces. In
addition, when the analyzer is in the system controller mode, the main CPU controls
peripheral devices through the peripheral port interfaces.
The main CPU has a dedicated flash ROM that contains the operating system for
instrument control. Front panel settings are stored in SRAM, with a battery providing at
least 5 years of backup storage when external power is off.
Main RAM
The main RAM (random access memory) is shared memory for the CPU and the digital
signal processor. It stores the raw data received from the digital signal processor, while
additional calculations are performed on it by the CPU. The CPU reads the resulting
formatted data from the main RAM and converts it to GSP commands. It writes these
commands to the GSP for output to the analyzer display.
Chapter 12
12-11
Theory of Operation
Digital Control Theory
EEPROM
EEPROM (electrically-erasable programmable read only memory) contains factory set
correction constants unique to each instrument. These constants correct for hardware
variations to maintain the highest measurement accuracy. The correction constants can be
updated by executing the routines in Chapter 3 , “Adjustments and Correction Constants.”
Digital Signal Processor
The digital signal processor receives the digitized data from the A10 digital IF. It computes
discrete Fourier transforms to extract the complex phase and magnitude data from the
4 kHz IF signal. The resulting raw data is written into the main RAM.
A18 Display
The A18 display is an 8.4 inch LCD with associated drive circuitry. It receives a +3.3 V
power supply from the A19 GSP, along with the voltage generated from the A27 backlight
inverter. It receives the following signals from the A19 GSP:
• digital TTL horizontal sync
• digital TTL vertical sync
• blanking
• data clock
• digital TTL red video
• digital TTL green video
• digital TTL blue video
A19 GSP
The A19 graphics system processor is the main interface between the A9 CPU and the A18
display. The CPU (A9) converts the formatted data to GSP commands and writes it to the
GSP. The GSP processes the data to obtain the necessary video signals, which are then
used for the following purposes:
• The video signals are used to produce VGA compatible RGB output signals, which are
routed to the A16 rear panel.
• The video signals are converted by an LVDS (low voltage differential signaling) driver
which translates the signals to low level differential signals to help eliminate radiated
emissions. The converted video signals are then routed to the A2 assembly, where they
are received and sent to the A18 display.
The A19 assembly receives the +5 VCPU which is used for processing and supplying power
to the A27 backlight inverter (+5 VCPU) and the A18 display (3.3 V).
12-12
Chapter 12
Theory of Operation
Digital Control Theory
A27 Inverter
The A27 backlight inverter assembly supplies the ac voltage for the backlight tube in the
A18 display assembly. This assembly takes the +5 VCPU and converts it to approximately
380 Vac with 5 mA of current at 40 kHz. There are two control lines:
• Digital ON/OFF
• Analog Brightness
— 100% intensity is 0 V
— 50% intensity is 4.5 V
A16 Rear Panel
The A16 rear panel includes the following interfaces:
• TEST SET I/O INTERCONNECT. This allows you to connect an 85046A/B or 85047A
S-parameter test set to the analyzer using the interconnect cable supplied with the test
set. The S-parameter test set is then fully controlled by the analyzer
This interface also provides control signals and power to operate duplexer test adapters.
• EXT REF. This allows for a frequency reference signal input that can phase lock the
analyzer to an external frequency standard for increased frequency accuracy.
The analyzer automatically enables the external frequency reference feature when a
signal is connected to this input. When the signal is removed, the analyzer
automatically switches back to its internal frequency reference.
• 10 MHZ PRECISION REFERENCE. (Option 1D5) This output is connected to the
EXT REF (described above) to improve the frequency accuracy of the analyzer.
• AUX INPUT. This allows for a dc or ac voltage input from an external signal source,
such as a detector or function generator, which you can then measure, using the
S-parameter menu. (You can also use this connector as an analog output in service
routines.)
• EXT AM. This allows for an external analog signal input that is applied to the ALC
circuitry of the analyzer's source. This input analog signal amplitude modulates the RF
output signal.
• EXT TRIG. This allows connection of an external negative TTL-compatible signal that
will trigger a measurement sweep. The trigger can be set to external through softkey
functions.
• TEST SEQ. This outputs a TTL signal that can be programmed in a test sequence to be
high or low, or pulse (10 µseconds) high or low at the end of a sweep for a robotic part
handler interface.
• LIMIT TEST. This outputs a TTL signal of the limit test results as follows:
— Pass: TTL high
— Fail: TTL low
• VGA OUTPUT. This provides a video output of the analyzer display that is capable of
running a PC VGA monitor.
Chapter 12
12-13
Theory of Operation
Source Theory Overview
Source Theory Overview
The source produces a highly stable and accurate RF output signal by phase-locking a YIG
oscillator to a harmonic of the synthesized VCO (voltage controlled oscillator). The source
output produces a CW or swept signal between 300 kHz and 3 GHz (or 30 kHz and 6 GHz
for Option 006) with a maximum leveled power of +20 dBm (or +18 dBm for Option 006)
and a minimum power of −5 dBm.
The full frequency range of the source is produced in 14 subsweeps: one in super low band,
two in low band, and eleven in high band. The high band frequencies (16 MHz to 3 GHz) or
(16 MHz to 6 GHz for Option 006) are achieved by harmonic mixing, with a different
harmonic number for each subsweep. The low band frequencies (300 kHz to 16 MHz) are
down-converted by fundamental mixing. The super low band frequencies (10 kHz to
300 kHz) are sent directly from the A12 reference board to the output of the A3 source
assembly. This band is not phased locked nor does it use the ALC. It is the basic amplified
output of the fractional-N synthesizer.
The source functional group consists of the individual assemblies described below.
A14/A13 Fractional-N
These two assemblies comprise the synthesizer. The 30 to 60 MHz VCO in the A14
assembly generates the stable LO frequencies for fundamental and harmonic mixing.
A12 Reference
This assembly provides stable reference frequencies to the rest of the instrument by
dividing down the output of a 40 MHz crystal oscillator. In low band operation, the output
of the fractional-N synthesizer is mixed down in the A12 reference assembly. (The 2nd LO
signal from the A12 assembly is explained in “Receiver Theory” on page 12-28.) The A12 is
also the origin of the super low band portion of the analyzer’s source.
A7 Pulse Generator
A step recovery diode in the pulse generator produces a comb of harmonic multiples of the
VCO output. These harmonics provide the high band LO (local oscillator) input to the
samplers. In low band and super low band the operation the pulse generator is turned off.
A11 Phase Lock
This assembly compares the first IF (derived from the source output in the A4 sampler) to
a stable reference, and generates an error voltage that is integrated into the drive for the
A3 source assembly.
12-14
Chapter 12
Theory of Operation
Source Theory Overview
A3 Source
This assembly includes a 3.0 to 6.8 GHz YIG oscillator and a 3.8 GHz cavity oscillator. The
outputs of these oscillators are mixed to produce the RF output signal. In Option 006
(30 kHz to 6 GHz), the frequencies 3.0 to 6.0 GHz are no longer a mixed product, but are
the direct output of the YIG oscillator. The signal tracks the stable output of the
synthesizer. The ALC (automatic leveling control) circuitry is also in the A3 assembly.
Chapter 12
12-15
Theory of Operation
Source Super Low Band Operation
Source Super Low Band Operation
The Super Low Band Frequency Range is 10 kHz to 300 kHz. These frequencies are
generated by the A12 reference board. They are the amplified output of the fractional-N
synthesizer. This output is not phase locked and is not subject to ALC control. Refer to
Table 12-1.
Table 12-1
Super Low Band Subsweep Frequencies
Fractional-N (MHz)
1st IF (MHz)
RF Output (MHz)
40.0 to 43.3
0.010 to 0.300
0.010 to 0.300
12-16
Chapter 12
Theory of Operation
Source Low Band Operation
Source Low Band Operation
The low band frequency range is 300 kHz to 16 MHz. These frequencies are generated by
locking the A3 source to a reference signal. The reference signal is synthesized by mixing
down the fundamental output of the fractional-N VCO with a 40 MHz crystal reference
signal. Low band operation differs from high band in these respects: The reference
frequency for the A11 phase lock is not a fixed 1 MHz signal, but varies with the frequency
of the fractional-N VCO signal. The sampler diodes are biased on to pass the signal
through to the mixer. The 1st IF signal from the A4 sampler is not fixed but is identical to
the source output signal and sweeps with it. The following steps outline the low band
sweep sequence, illustrated in Figure 12-4.
1. A signal (FN LO) is generated by the fractional-N VCO. The VCO in the A14
Fractional-N assembly generates a CW or swept signal that is 4O MHz greater than the
start frequency. The signal is divided down to 100 kHz and phase locked in the A13
assembly, as in high band operation.
2. The fractional-N VCO signal is mixed with 40 MHz to produce a reference
signal. The signal (FN LO) from the Fractional-N VCO goes to the A12 reference
assembly, where it is mixed with the 4O MHz VCXO (voltage controlled crystal
oscillator). The resulting signal is the reference to the phase comparator in the A11
assembly.
3. The A3 source is pretuned. The signal (RF OUT) is fed to the A4 sampler. The
pretuned DAC in the A11 phase lock assembly sets the A3 source to a frequency 1 to
6 MHz above the start frequency. This signal (RF OUT) goes to the A4 R input
sampler/mixer assembly. (The source RF output must be connected externally to the R
input connector on the analyzer.)
4. The signal from the source is fed back (1st IF) to the phase comparator. The
source output signal passes directly through the sampler in the A4 assembly, because
the sampler is biased on. The signal (1st IF) is fed back unaltered to the phase
comparator in the A11 phase lock assembly. The other input to the phase comparator is
the heterodyned reference signal from the A12 assembly. Any frequency difference
between these two signals produces a proportional error voltage.
5. A tuning signal (YO DRIVE) tunes the source and phase lock is achieved. The
error voltage is used to drive the A3 source YIG oscillator to bring the YIG closer to the
reference frequency. The loop process continues until the source frequency and the
reference frequency are the same, and phase lock is achieved.
6. A synthesized sub sweep is generated. The source tracks the synthesizer.
When lock is achieved at the start frequency, the synthesizer starts to sweep. This
changes the phase lock reference frequency, and causes the source to track at a
difference frequency 40 MHz below the synthesizer.
Chapter 12
12-17
Theory of Operation
Source Low Band Operation
Figure 12-4
Low Band Operation of the Source
The full low band is produced in two sub sweeps, to allow addition IF filtering below
3 MHz. At the transition between subsweeps, the source is pretuned and then relocks.
Table 12-2 lists the low band subsweep frequencies at the fractional-N VCO and the RF
output.
Table 12-2
Low Band Subsweep Frequencies
Fractional-N (MHz)
1st IF (MHz)
Source Output
(MHz)
40.3 to 43.3
0.3 to 3.3
0.3 to 3.3
43.3 to 56.0
3.3 to 16.0
3.3 to 16.0
12-18
Chapter 12
Theory of Operation
Source High Band Operation
Source High Band Operation
The high band frequency range is 16 MHz to 3.0 GHz or 16 MHz to 6.0 GHz with
Option 006. These frequencies are generated in subsweeps by phase-locking the A3 source
signal to harmonic multiples of the fractional-N VCO. The high band subsweep sequence,
illustrated in Figure 12-5, follows these steps:
1. A signal (HI OUT) is generated by the fractional-N VCO. The VCO in the A14
fractional-N assembly generates a CW or swept signal in the range of 30 to 60 MHz.
This signal is synthesized and phase locked to a 100 kHz reference signal from the A12
reference assembly. The signal from the fractional-N VCO is divided by 1 or 2, and goes
to the pulse generator.
2. A comb of harmonics (1st LO) is produced in the A7 pulse generator. The
divided down signal from the fractional-N VCO drives a step recovery diode (SRD) in
the A7 pulse generator assembly. The SRD multiplies the fundamental signal from the
fractional-N into a comb of harmonic frequencies. The harmonics are used as the 1st LO
(local oscillator) signal to the samplers. One of the harmonic signals is 1 MHz below the
start signal set from the front panel.
3. The A3 source is pretuned. The source RF OUT is fed to the A4 sampler. The
pretune DAC in the A11 phase lock assembly sets the A3 source to a first approximation
frequency (1 to 6 MHz higher than the start frequency). This signal (RF OUT) goes to
the A4 R input sampler/mixer assembly.
4. The synthesizer signal and the source signal are combined by the sampler. A
difference frequency is generated. In the A4 sampler, the 1st LO signal from the
pulse generator is combined with the source output signal. The IF (intermediate
frequency) produced is a first approximation of 1 MHz. This signal (1st IF) is routed
back to the A11 phase lock assembly.
5. The difference frequency (1st IF) from the A4 sampler is compared to a
reference. The 1st IF feedback signal from the A4 is filtered and applied to a phase
comparator circuit in the A11 phase lock assembly. The other input to the phase
comparator is a crystal controlled 1 MHz signal from the A12 reference assembly. Any
frequency difference between these two signals produces a proportional error voltage.
6. A tuning signal (YO DRIVE) tunes the source and phase lock is achieved. The
error voltage is used to drive the A3 source YIG oscillator, in order to bring it closer to
the required frequency. The loop process continues until the 1st IF feedback signal to
the phase comparator is equal to the 1 MHz reference signal, and phase lock is
achieved.
Chapter 12
12-19
Theory of Operation
Source High Band Operation
7. A synthesized subsweep is generated by A13/A14. The A3 source tracks the
synthesizer. When the source is phase locked to the synthesizer at the start frequency,
the synthesizer starts to sweep. The phase locked loop forces the source to track the
synthesizer, maintaining a constant 1 MHz 1st IF signal.
The full high band sweep is generated in a series of subsweeps, by phase locking the A3
source signal to harmonic multiples of the fractional-N VCO. The 16 to 31 MHz
subsweep is produced by a one half harmonic, using the divide-by-2 circuit on the A14
assembly. At the transitions between subsweeps, the source is pretuned and then
relocks. Table 12-3 lists the high band subsweep frequencies from the fractional-N VCO
and the source output.
Figure 12-5
12-20
High Band Operation of the Source
Chapter 12
Theory of Operation
Source High Band Operation
Table 12-3
High Band Subsweep Frequencies
Fractional-N (MHz)
Harmonic
Source Output (MHz)
30 to 60
1/2
16 to 31
30 to 60
1
31 to 61
30 to 60
2
61 to 121
40 to 59
3
121 to 178
35.4 to 59.2
5
178 to 296
32.8 to 59.4
9
296 to 536
35.7 to 59.5
15
536 to 893
33.0 to 59.5
27
893 to 1607
31.5 to 58.8
51
1607 to 3000
Option 006
37.0 to 59.6
83
3000 to 4950
49.0 to 59.4
101
4950 to 6000
Chapter 12
12-21
Theory of Operation
Source Operation in Other Modes/Features
Source Operation in Other Modes/Features
Besides the normal network analyzer mode, the analyzer has extra modes and features to
make additional types of measurements. The following describes the key differences in
how the analyzer operates to achieve these new measurements.
Frequency Offset
The analyzer can measure frequency-translating devices with the frequency offset feature.
The receiver operates normally. However, the source is pretuned to a different frequency by
an offset entered by the user. The device under test will translate this frequency back to
the frequency the receiver expects. Otherwise, phase locking and source operation occur as
usual.
Harmonic Analysis (Option 002)
The analyzer can measure the 2nd or 3rd harmonic of the fundamental source frequency,
on a swept or CW basis, with the harmonic analysis feature (optional).
To make this measurement, the reference frequency (normally 1 MHz) from the A12
reference assembly to the A11 phase lock assembly is divided by 1, 2, or 3. See Figure 12-6.
The fractional-N assemblies are also tuned so that the correct harmonic (comb tooth) of the
1st LO is 0.500 or 0.333 MHz below the source frequency instead of the usual 1.000 MHz.
The analyzer pretunes the A3 source normally, then phase locks the 1st IF to the new
reference frequency to sweep the fundamental source frequency in the usual way. The key
difference is that the 1st IF (output from the R sampler) due to the fundamental and used
for phase locking is now 0.500 or 0.333 MHz instead of 1.000 MHz.
Since the chosen VCO harmonic and the source differ by 0.500 or 0.333 MHz, then another
VCO harmonic, 2 or 3 times higher in frequency, will be exactly 1.000 MHz away from the
2nd or 3rd harmonic of the source frequency. The samplers, then, will also down-convert
these harmonics to yield the desired components in the 1st IF at 1.000 MHz. Narrow
bandpass filters in the receiver eliminate all but the 1.000 MHz signals; these pass
through to be processed and displayed.
12-22
Chapter 12
Theory of Operation
Source Operation in Other Modes/Features
Figure 12-6
Chapter 12
Harmonic Analysis
12-23
Theory of Operation
Source Operation in Other Modes/Features
External Source Mode
In external source mode, the analyzer phase locks its receiver to an external signal source.
This source must be CW (not swept), but it does not need to be synthesized. The user must
enter the source frequency into the analyzer. (The analyzer's internal source output is not
used.)
To accomplish this, the phase lock loop is reconnected so that the tuning voltage from the
A11 phase lock assembly controls the VCO of the A14 fractional-N assembly and not the
A3 source. See Figure 12-7. The VCO's output still drives the 1st LO of the samplers and
down-converts the RF signal supplied by the external source. The resulting 1st IF is fed
back to the A11 phase lock assembly, compared to the 1.000 MHz reference, and used to
generate a tuning voltage as usual. However, the tuning voltage controls the VCO to lock
on to the external source, keeping the 1st IF at exactly 1.000 MHz.
The analyzer normally goes through a pretune-acquire-track sequence to achieve phase
lock. In external source mode, the fractional-N VCO pretunes as a closed-loop synthesizer
referenced to the 100 kHz signal from the A12 reference assembly. Then, to acquire or
track, a switch causes the VCO to be tuned by the A11 phase lock assembly instead. (Refer
to the overall block diagram at the end of Chapter 4 , “Start Troubleshooting Here.”)
Figure 12-7
12-24
External Source Mode
Chapter 12
Theory of Operation
Source Operation in Other Modes/Features
Tuned Receiver Mode
In tuned receiver mode, the analyzer is a synthesized, swept, narrow-band receiver only.
The external signal source must be synthesized and reference-locked to the analyzer.
To achieve this, the analyzer's source and phase lock circuits are completely unused. See
Figure 12-8. The fractional-N synthesizer is tuned so that one of its harmonics (1st LO)
down-converts the RF input to the samplers. (In contrast to external source mode, the
analyzer does not phase lock at all. However, the 1st LO is synthesized.)
The analyzer can function as a swept tuned receiver, similar to a spectrum analyzer, but
the samplers create spurious signals at certain frequencies, which limit the accuracy of
such measurements.
Figure 12-8
Chapter 12
Tuned Receiver Mode
12-25
Theory of Operation
Signal Separation
Signal Separation
External Test Sets
The HP/Agilent 85047A S-parameter test set contains a switched frequency doubler to
double the analyzer’s source frequency. A portion of the RF signal is coupled to the
analyzer R input for reference. (For analyzers with Option 006, the frequency doubler is
bypassed since the analyzer's source is capable of generating a swept RF signal up to
6 GHz.) The remaining signal is routed through a 70 dB programmable step attenuator to
the directional couplers for reflection and transmission measurements. The couplers allow
detection of the signal from 300 kHz to 6 GHz. These couplers provide low insertion loss
between the RF input and the test ports. Two bias tees supply external biasing for active
devices. Figure 12-9 includes a simplified block diagram of the 85047A.
The HP/Agilent 85046A/B S-parameter test set contains a power splitter to divert a
portion of the incident signal to the R input of the analyzer for reference. The remainder of
the incident signal is routed through a switch to one of two directional bridges at the
measurement ports. The RF path switch is controlled by the analyzer to enable switching
between forward and reverse measurements. A 70 dB step attenuator in the test set, also
controlled from the analyzer, adjusts the power level to the DUT without changing the
level of the incident power in the reference path. Two bias tees are included, for external
biasing of active devices connected to the test ports. Figure 12-9 includes a simplified block
diagram of the 85046A/B.
The HP/Agilent 85044A/B transmission/reflection test set contains a power splitter
to divert a portion of the incident signal to the R input of the analyzer. The remainder of
the incident signal is routed through a directional bridge to the measurement port. The
test set includes a manually controlled 70 dB step attenuator, and a bias tee for external
biasing of active devices connected to the test port. A simplified block diagram of the
85044A/B is included in Figure 12-9.
An HP/Agilent 11850C/D or 11667A power splitter can be used instead of a test set for
transmission measurements only.
12-26
Chapter 12
Theory of Operation
Signal Separation
Figure 12-9
Chapter 12
Test Set Block Diagrams
12-27
Theory of Operation
Receiver Theory
Receiver Theory
The receiver functional group consists of the following assemblies:
• A4 sampler/mixer
• A5 sampler/mixer
• A6 sampler/mixer
• A10 digital IF
These assemblies combine with the A9 CPU (described in “Digital Control Theory” on
page 12-9) to measure and process input signals into digital information for display on the
analyzer. Figure 12-10 is a simplified block diagram of the receiver functional group. The
A12 reference assembly is also included in the illustration to show how the 2nd LO signal
is derived.
Figure 12-10
12-28
Receiver Functional Group, Simplified Block Diagram
Chapter 12
Theory of Operation
Receiver Theory
A4/A5/A6 Sampler/Mixer
The A4, A5, and A6 sampler/mixers all down-convert the RF input signals to fixed 4 kHz
2nd IF signals with amplitude and phase corresponding to the RF input.
The Sampler Circuit in High Band
In high band operation, the sampling rate of the samplers is controlled by the 1st LO from
the A7 pulse generator assembly. The 1st LO is a comb of harmonics produced by a step
recovery diode driven by the fractional-N VCO fundamental signal. One of the harmonic
signals is 1 MHz below the start frequency set at the front panel. The 1st LO is combined
in the samplers with the RF input signal from the source. In analyzers with Option 006,
samplers are additionally capable of recognizing RF input signals from 3 to 6 GHz. The
mixing products are filtered, so that the only remaining response is the difference between
the source frequency and the harmonic 1 MHz below it. This fixed 1 MHz signal is the
1st IF. Part of the 1st IF signal from the R sampler is fed back to the A11 phase lock
assembly. (The RF output must be connected externally to the R input connector for
phase-locked operation.)
The Sampler Circuit in Low Band or Super Low Band
In low band or super low band (in analyzers with Option 006), the sampler diodes are
biased continuously on, so that the RF input signal passes through them unchanged. Thus
the 1st IF is identical to the RF output signal from the source (300 kHz to 16 MHz for
lowband; 10 to 300 kHz for super lowband), and sweeps with it. Part of the 1st IF signal
from the R sampler is fed back to the A11 phase lock assembly.
(Refer to “Source Theory Overview” on page 12-14 for information on high band and low
band operation of the source.)
The 2nd LO Signal
The 2nd LO is obtained from the A12 reference assembly. In high band, the 2nd LO is fixed
at 996 kHz. This is produced by feeding the 39.84 MHz output of a phase-locked oscillator
in the A12 assembly through a divide-by-40 circuit.
In low band, the 2nd LO is a variable frequency produced by mixing the output of the
fractional-N VCO with a fixed 39.996 MHz signal in the A12 assembly. The 2nd LO covers
the range of 0.304 to 16.004 MHz (or 0.014 to 16.004 MHz for Option 006) in two
subsweeps that correspond with the source subsweeps. These subsweeps are 0.304 to
3.304 MHz and 3.304 to 16.004 MHz.
Chapter 12
12-29
Theory of Operation
Receiver Theory
The Mixer Circuit
The 1st IF and the 2nd LO are combined in the mixer circuit. The resulting difference
frequency (the 2nd IF) is a constant 4 kHz in both bands, as shown in Table 12-4.
Table 12-4
Mixer Frequencies
Band
1st IF
2nd LO
2nd IF
Super Lowa
0.010 to 0.300 MHz
0.014 to 0.304 MHz
4.0 kHz
Low
0.300 to 16.0 MHz
0.304 to 16.004 MHz
4.0 kHz
High
1.000 MHz
0.996 MHz
4.0 kHz
a. Analyzers with Option 006 only.
A10 Digital IF
The three 4 kHz 2nd IF signals from the sampler/mixer assemblies are input to the A10
digital IF assembly. These signals are sampled at a 16 kHz rate. A fourth input is the
analog bus, which can monitor either an external input at the rear panel AUX IN
connector, or one of 31 internal nodes. A multiplexer sequentially directs each of the
signals to the ADC (analog-to-digital converter). Here they are converted to digital form
and sent to the A9 CPU assembly for processing. Refer to “Digital Control Theory” on
page 12-9 for more information on signal processing.
12-30
Chapter 12
13 Replaceable Parts
13-1
Replaceable Parts
Replaceable Parts
Replaceable Parts
This chapter contains information for ordering replacement parts for the analyzer.
Replaceable parts include the following:
• major assemblies
• cables
• chassis hardware
In general, lower-level parts of major assemblies are not listed. Refer to Table 13-1 on
page 40 at the back of this chapter to help interpret part descriptions in the replaceable
parts lists that follow.
13-2
Chapter 13
Replaceable Parts
Replacing an Assembly
Replacing an Assembly
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to the information in this chapter.
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
Chapter 14 , “Assembly Replacement and Post-Repair Procedures.”
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
Chapter 13
13-3
Replaceable Parts
Rebuilt-Exchange Assemblies
Rebuilt-Exchange Assemblies
Under the rebuilt-exchange assembly program, certain factory-repaired and tested
modules (assemblies) are available on a trade-in basis. These assemblies are offered for
lower cost than a new assembly, but meet all factory specifications required of a new
assembly.
The defective assembly must be returned for credit under the terms of the
rebuilt-exchange assembly program. Any spare assembly stock desired should be ordered
using the new assembly part number. Figure 13-1 on page 6 illustrates the module
exchange procedure. “Major Assemblies, Top” on page 13-8 and “Major Assemblies,
Bottom” on page 13-10 list all major assemblies, including those that can be replaced on an
exchange basis.
13-4
Chapter 13
Replaceable Parts
Ordering Information
Ordering Information
To order a part listed in the replaceable parts lists, quote the part number, indicate the
quantity required, and address the order to the nearest Agilent Technologies office.
To order a part that is not listed in the replaceable parts lists, include the instrument
model number, complete instrument serial number, the description and function of the
part, and the number of parts required. Address the order to the nearest Agilent
Technologies office.
Chapter 13
13-5
Replaceable Parts
Ordering Information
Figure 13-1
13-6
Module Exchange Program
Chapter 13
Replaceable Parts
Replaceable Part Listings
Replaceable Part Listings
The following pages list the replacement part numbers and descriptions for the analyzer.
Illustrations with reference designators are provided to help identify and locate the part
needed. The parts lists are organized into the following categories:
• Major Assemblies, Top on page 13-8
• Major Assemblies, Bottom on page 13-10
• Cables, Top on page 13-12
• Cables, Bottom on page 13-14
• Cables, Front on page 13-15
• Cables, Rear on page 13-16
• Cables, Source on page 13-17
• Front Panel Assembly, Outside on page 13-18
• Front Panel Assembly, Inside on page 13-20
• Rear Panel Assembly on page 13-22
• Rear Panel Assembly, Option 1D5 on page 13-24
• Hardware, Top on page 13-26
• Hardware, Bottom on page 13-28
• Hardware, Front on page 13-29
• Hardware, Type-N Connector Assembly on page 13-30
• Hardware, Disk Drive Support on page 13-31
• Hardware, Memory Deck on page 13-32
• Hardware, Preregulator on page 13-33
• Chassis Parts, Outside on page 13-34
• Chassis Parts, Inside on page 13-36
• Miscellaneous on page 13-37
Chapter 13
13-7
Replaceable Parts
Replaceable Part Listings
Major Assemblies, Top
Ref. Desig.
Option
Part Number
Qty
A1, A2
Description
NOT SHOWN (see “Front Panel Assembly, Inside” on
page 13-20)
A3
08753-60232
1
ASSEMBLY-SOURCE 3 GHz (EXCHANGE: 08753-69232)
08753-60230
1
ASSEMBLY-SOURCE 6 GHz (EXCHANGE: 08753-69230)
A4
08753-60951
1
ASSEMBLY-SAMPLER R
A5
08753-60951
1
ASSEMBLY-SAMPLER A
A6
08753-60951
1
ASSEMBLY-SAMPLER B
A7
08753-60164
1
BOARD ASSEMBLY-PULSE GENERATOR
A8a
08753-60949
1
BOARD ASSEMBLY-POST REGULATOR
A10
08753-60958
1
BOARD ASSEMBLY-DIGITAL IF
A11
08753-60162
1
BOARD ASSEMBLY-PHASE LOCK
A12
08753-60957
1
BOARD ASSEMBLY-REFERENCE
A13
08753-60013
1
BOARD ASSEMBLY-FRAC N ANALOG
A14
08753-60068
1
BOARD ASSEMBLY-FRAC N DIGITAL
A15
0950-3488
1
ASSEMBLY-PREREGULATOR
A3
006
A16, B1
NOT SHOWN (see “Rear Panel Assembly” on
page 13-22)
A17
NOT SHOWN (see “Chassis Parts, Inside” on
page 13-36)
A18, A27,
RPG
1
NOT SHOWN (see “Front Panel Assembly, Inside” on
page 13-20)
A19
08753-60359
1
BOARD ASSEMBLY-GRAPH. PROCESSOR (GSP)
(under sheet metal cover)
A20
0950-2782
1
ASSEMBLY-DISK DRIVE
A26
1D5
NOT SHOWN (see “Rear Panel Assembly, Option 1D5”
on page 13-24)
a. For fuse part numbers for the A8 board, refer to “Miscellaneous” on page 13-37.
13-8
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-2
Chapter 13
Major Assemblies, Top
13-9
Replaceable Parts
Replaceable Part Listings
Major Assemblies, Bottom
Ref.
Desig.
HP/Agilent
Part Number
Qty
A9
08753-60315
1
CPU REPAIR KIT (EXCHANGE: 08753-69315)
CPU FAN
5060-8776
1
A9 CPU FAN
A9BT1
1420-0338
1
BATTERY-LITHIUM 3V 1.2AH
A17
08753-60360
1
BOARD ASSEMBLY - MOTHER
Figure 13-3
13-10
Description
Major Assemblies, Bottom
Chapter 13
Replaceable Parts
Replaceable Part Listings
This page intentionally left blank.
Chapter 13
13-11
Replaceable Parts
Replaceable Part Listings
Cables, Top
Ref.
Desig.
Typea
1
HP/Agilent
Part
Number
Qty
Description
1400-0249
1
CABLE TIE (15W1 to CHASSIS)
A15W1
18W
(part of A15)
1
PREREGULATOR (A15) to POST REGULATOR (A8J2) and
MOTHERBOARD (A17J3)
W1
SR
08753-20281
1
SOURCE ASSEMBLY (A3W7) to FP-RF OUTPUT
W2
SR
08753-20284
1
FP-R CHANNEL INPUT to SAMPLER-R (A4)
W3
SR
08753-20282
1
FP-A CHANNEL INPUT to SAMPLER-A (A5)
W4
SR
08753-20283
1
FP-B CHANNEL INPUT to SAMPLER-B (A6)
W5
F
08753-60027
1
SAMPLER-R (A4) to PULSE GENERATOR (A7)
W6
F
08753-60027
1
SAMPLER-A (A5) to PULSE GENERATOR (A7)
W7
F
08753-60027
1
SAMPLER-B (A6) to PULSE GENERATOR (A7)
W8
F
08753-60029
1
PHASE LOCK (A11J1) to SAMPLER-R (A4)
W9
F
8120-5021
1
FRAC-N DIGITAL (A14J1) to PULSE GENERATOR (A7)
W10
F
08753-60029
1
FRAC-N DIGITAL (A14J2) to REFERENCE (A12J1)
W11
F
08753-60029
1
FRAC-N DIGITAL (A14J3) to FRAC-N ANALOG (A13J1)
W12
F
08753-60029
1
FRAC-N ANALOG (A13J2) to REFERENCE (A12J2)
W13
F
08753-60026
1
REFERENCE (A12J3) to RP (EXT REF)
W21
14R
8120-6876
1
MOTHERBOARD (A17J12) to REAR PANEL VGA OUT
W20
34R
8120-6890
1
MOTHERBOARD (A17J11) to CPU (A9J5)
a. nW = Wire Bundle (n is the number of wires in the bundle)
nR = Ribbon Cable (n is the number of wires in the ribbon)
F = Flexible Coax Cable
SR = Semi-Rigid Coax Cable
13-12
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-4
Cables, Top
Cable connections
for A7 Pulse Generators
produced after 01 July 2004.
Chapter 13
13-13
Replaceable Parts
Replaceable Part Listings
Cables, Bottom
Ref.
Desig.
Typea
1
HP/Agilent
Part
Number
Qty
Description
1400-0611
1
CABLE CLAMP
W20
34R
8120-6890
1
MOTHERBOARD (A17J11) to CPU (A9J5)
W37
26R
8120-8670
1
DISK DRIVE (A20) to CPU (A9J15)
a. nR = Ribbon Cable (n is the number of wires in the ribbon)
Figure 13-5
13-14
Cables, Bottom
Chapter 13
Replaceable Parts
Replaceable Part Listings
Cables, Front
Ref. Desig.
Typea
HP/Agilent
Part Number
Qty
Description
A1W1
30R
8120-8439
1
FP KEYBOARD (A1J1) to FP INTERFACE (A2J2)
RPG1W1
5R
(part of RPG1)
1
RPG to FP INTERFACE (A2J5)
W1
SR
08753-20281
1
SOURCE ASSEMBLY (A3W4) to RF OUT (A24)
W2
SR
08753-20284
1
FP (R CHANNEL IN) to SAMPLER-R (A4)
W3
SR
08753-20282
1
FP (A CHANNEL IN) to SAMPLER-A (A5)
W4
SR
08753-20283
1
FP (B CHANNEL IN) to SAMPLER-B (A6)
W17
50R
8120-8431
1
FP INTERFACE (A2J1) to MOTHERBOARD (A17J1)
W18
3W
08753-60364
1
FP INTERFACE (A2J4) to FP (PROBE POWER)
W19
3W
08753-60364
1
FP INTERFACE (A2J3) to FP (PROBE POWER)
W22
5R
8120-8842
1
FP INTERFACE (A2J7) to INVERTER (A27)
W23
31R
8120-8409
1
FP INTERFACE (A2J6) to DISPLAY (A18)
a. nW = Wire Bundle (n is the number of wires in the bundle)
nR = Ribbon Cable (n is the number of wires in the ribbon)
SR = Semi-Rigid Coax Cable
Figure 13-6
Chapter 13
Cables, Front
13-15
Replaceable Parts
Replaceable Part Listings
Cables, Rear
Ref.
Desig.
Typea
B1W1
Opt
HP/Agilent
Part Number
Qty
2W
(part of B1)
1
FAN (B1) to MOTHERBOARD (A17J5)
W13
F
08753-60026
1
REFERENCE (A12J3) to RP (EXT REF)
W21
14R
8120-6876
1
MOTHERBOARD (A17J12) to RP (VGA OUT)
W27
34R
8120-6407
1
RP INTERFACE (A16J4) to MOTHERBOARD
(A17J6)
W30
3W
8120-6458
1
RP INTERFACE (A16J3) to HIGH-STABILITY
FREQ REF (A26J1)
W35
50R
8120-6379
1
CPU (A9J1) to MOTHERBOARD (A17J7)
W36
26R
8120-6382
1
CPU (A9J2) to MOTHERBOARD (A17J8)
1D5
Description
a. nW = Wire Bundle (n is the number of wires in the bundle)
nR = Ribbon Cable (n is the number of wires in the ribbon)
F = Flexible Coax Cable
Figure 13-7
13-16
Cables, Rear
Chapter 13
Replaceable Parts
Replaceable Part Listings
Cables, Source
Ref.
Desig.
Typea
HP/Agilent
Part Number
Qty
Description
A3A2W1
10R
08753-60034
1
EYO (A3A3) to ALC (A3A2J3)
A3A4W1
4W
08753-60035
1
CAVITY OSC (A3A4) to ALC (A3A2J2)
A3W1
SR
08753-20107
1
EYO (A3A3) to SOURCE ASSEMBLY (A3)
A3W2
SR
08753-20032
1
CAVITY OSC (A3A4) to SOURCE ASSEMBLY (A3)
A3W7
SR
08753-20110
1
SOURCE ASSEMBLY (A3) to W1
a. nW = Wire Bundle (n is the number of wires in the bundle)
nR = Ribbon Cable (n is the number of wires in the ribbon)
SR = Semi-Rigid Coax Cable
Figure 13-8
Chapter 13
Cables, Source
13-17
Replaceable Parts
Replaceable Part Listings
Front Panel Assembly, Outside
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
08753-80169
1
OVERLAY, LOWER FRONT PANEL
2
08753-60939
1
FRONT PANEL REPAIR KIT a
3
1510-0038
1
GROUND POST
4
2950-0006
1
NUT HEX 1/4-32
4
2190-0067
1
WASHER LK .256 ID
5
08753-40015
1
LINE BUTTON
6
08753-80216
1
OVERLAY, UPPER FRONT PANEL
08753-80206
1
7
08753-80205
Description
NAME PLATE, 8753ES, 300 kHz − 3 GHz
NAME PLATE, 8753ES, 30 kHz − 6 GHz (OPTION 006)
a. Comes with casting, gasket, upper and lower overlays.
Figure 13-9
13-18
Front Panel Assembly, Outside
Chapter 13
Replaceable Parts
Replaceable Part Listings
This page intentionally left blank.
Chapter 13
13-19
Replaceable Parts
Replaceable Part Listings
Front Panel Assembly, Inside
Ref.
Desig.
Opt
HP/Agilent
Part Number
Qty
1
08753-00150
1
DISPLAY HOLD DOWN
2
2090-0386
1
DISPLAY LAMP
3
1000-0995
1
DISPLAY GLASS
7
1990-1864
1
RPG (INCLUDES CABLE AND HARDWARE)
8
E4400-40003
1
RPG KNOB
9
08720-40016
1
FLUBBER KEYPAD
10
0515-0430
8
SCREW SM 3.0 6CWPNTX
11
0515-0665
4
SCREW SMM 3.0 14CWPNTX
12
1400-1439
2
CABLE CLIP
13
0515-0372
3
SCREW SMM 3.0 8CWPNTX
14
08753-60364
2
CABLE ASSEMBLY, PROBE POWER
14
2950-0144
2
NUT, HEX 3/8-32
15
08753-00112
1
PLATE, PROBE POWER
16
0515-0430
2
SCREW SMM 3.0 6CWPNTX
17
08753-20948
1
COVER, INVERTER
A1
08720-60267
1
BOARD ASSEMBLY-FRONT PANEL
A2
08753-60358
1
BOARD ASSEMBLY-FRONT PANEL INTERFACE
A18
08753-60937
1
LCD REPLACEMENT ASSEMBLY
A27
0950-3379
1
ASSEMBLY-INVERTER
Typea
Description
A1W1
26R
8120-8439
1
A1 TO A2
W17
50R
8120-8431
1
A2 TO A17
W22
5R
8120-8842
1
CABLE-FP INTF (A2J7) to INVERTER (A27)
W23
31R
8120-8409
1
CABLE-FP INTF (A2J6) to DISPLAY (A18)
a. nR = Ribbon Cable (n is the number of wires in the ribbon)
13-20
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-10
Chapter 13
Front Panel Assembly, Inside
13-21
Replaceable Parts
Replaceable Part Listings
Rear Panel Assembly
Ref.
Desig.
Typea
HP/Agilent
Part Number
Qty
1
34R
8120-6407
1
RP INTERFACE (A16J4) TO MB (A17J6) (W27)
3
08720-60138
1
BOARD ASSEMBLY-REAR PANEL INTERFACE (A16)
4
08753-60026
1
ASSEMBLY-EXTERNAL REFERENCE CABLE (W13)
5
08415-60036
1
ASSEMBLY-FAN
6
1251-2942
4
FASTENER CONN RP LOCK
7
2190-0034
2
WASHER LK .194ID10
7
0380-0644
2
NUT STDF .327L 6-32
8
1251-7812
4
FASTENER CONN RP LOCK
9
0515-0379
4
SCREW SMM3.5X16 CWPNTX
9
3050-1192
4
FLAT WASHER
10
0515-0372
10
SCREW SMM3.0X8 CWPNTX
11
08720-00071
1
REAR PANEL SHEET METAL
12
3160-0281
1
FAN GUARD
13
6960-0419
1
HOLE PLUG
14
6960-0086
1
HOLE PLUG
15
2190-0102
6
WASHER LK .472ID
15
2950-0035
6
NUT HEX 15/32-32
16
0400-0271
1
GROMMET SN.5-515ID
17
6960-0027
2
HOLE PLUG
18
6960-0149
2
HOLE PLUG
19
Description
(see “Rear Panel Assembly, Option 1D5” on
page 13-24)
a. nR = Ribbon Cable (n is the number of wires in the ribbon)
13-22
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-11
Chapter 13
Rear Panel Assembly
13-23
Replaceable Parts
Replaceable Part Listings
Rear Panel Assembly, Option 1D5
Ref.
Desig.
Option
HP/Agilent
Part Number
Qty
Description
1
1D5
1250-1859
1
ADAPTER-COAX
2
1D5
0515-0374
1
SCREW-MACHINE M3.0×10 CW-PN-TX
3
1D5
3050-1546
1
WASHER-FLAT .505ID NY
4
1D5
2190-0068
1
WASHER-LOCK .505ID
5
1D5
2950-1310
1
NUT-SPECIALTY 1/2-28
6
1D5
0515-0430
1
SCREW-MACHINE M3.0×6 CW-PN-TX
7
1D5
08753-00078
1
BRACKET-OSC BOARD
8
6960-0027
4
HOLE PLUGS
9
6960-0149
2
HOLE PLUGS
A26
1D5
08753-60158
1
BOARD ASSEMBLY-HIGH STABILITY FREQ REF
W30
1D5
8120-6458
1
RP INTERFACE (A16J3) to HIGH-STABILITY FREQ REF
(A26J1)
13-24
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-12
Chapter 13
Rear Panel Assembly, Option 1D5
13-25
Replaceable Parts
Replaceable Part Listings
Hardware, Top
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
0515-2799
2
SCREW-MACHINE M3.0×10 CW-FL-TX
2
08753-40014
1
STABILIZER-PC BOARD
3
08753-20062
1
STABILIZER CAP
4
0515-2035
1
SCREW-MACHINE M3.0×16 PC-FL-TX
5
0515-0458
2
SCREW-MACHINE M3.5×8 CW-PN-TX
6
08753-00107
1
AIR FLOW COVER
7
0515-0374
2
SCREW-MACHINE M3.0 X 10 CW-PN-TX
8
0515-0377
2
SCREW-MACHINE M3.5×10 CW-PN-TX
9
0515-0374
2
SCREW-MACHINE M3.0×12 CW-PN-TX
10
08753-00129
1
GSP COVER
11
08753-00145
1
BRACKET-SOURCE (SOURCE STRAP)
12
0515-0374
6
SCREW-MACHINE M3.0 X 10 CW-PN-TX
13
0515-0374
15
SCREW-MACHINE M3.0×10 CW-PN-TX
14
08753-00040
1
CLIP-PULSER GROUND
15
0515-1400
3
SCREW-MACHINE M3.5×8 PC-FL-TX
13-26
Description
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-13
Chapter 13
Hardware, Top
13-27
Replaceable Parts
Replaceable Part Listings
Hardware, Bottom
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
0515-0458
4
SCREW-MACHINE M3.5×8 CW-PN-TX
2
0515-0430
3
SCREW-MACHINE M3.0×6 CW-PN-TX
3
0515-0458
1
SCREW-MACHINE M3.5×8 CW-PN-TX
4
0515-0375
1
SCREW-MACHINE M3.0×16 CW-PN-TX
5
08753-00139
1
SUPPORT BRACKET
6
0515-1400
4
SCREW-MACHINE M3.5×8 PC-FL-TX
Figure 13-14
13-28
Description
Hardware, Bottom
Chapter 13
Replaceable Parts
Replaceable Part Listings
Hardware, Front
Ref.
Desig.
Option
HP/Agilent
Part Number
Qty
1
08753-00137
1
BRACKET-CABLE SUPPORT
2
0515-0665
1
SCREW -MACHINE 3.0X14 CW-PN-TX
Figure 13-15
Chapter 13
Description
Hardware, Front
13-29
Replaceable Parts
Replaceable Part Listings
Hardware, Type-N Connector Assembly
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
86290-60005
4
CONNECTOR ASSEMBLY TYPE-N
2
08753-00140
1
BRACKET-MOUNT OPTION O11
3
2190-0104
4
WASHER-LOCK .439ID
4
2950-0132
4
NUT-HEX 7/16-28
Figure 13-16
13-30
Description
Hardware, Type-N Connector Assembly
Chapter 13
Replaceable Parts
Replaceable Part Listings
Hardware, Disk Drive Support
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
0515-1048
4
SCREW-M 2.5X4 SOCKET HEAD, HEX.
2
08753-00152
1
DISK DRIVE BRACKET
3
0515-0374
4
SCREWS -MACHINE M 3.0X10 CWPNTX
4
08753-40016
1
PLUG, DISK DRIVE
Figure 13-17
Chapter 13
Description
Hardware, Disk Drive Support
13-31
Replaceable Parts
Replaceable Part Listings
Hardware, Memory Deck
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
0515-0458
4
SCREW-MACHINE M3.5×8 CW-PN-TX
2
0515-0430
2
SCREW-MACHINE M3.0×6 CW-PN-TX
3
0515-0375
1
SCREW-MACHINE M3.0×14 CW-PN-TX
4
08753-00128
1
DECK-MEMORY
Figure 13-18
13-32
Description
Hardware, Memory Deck
Chapter 13
Replaceable Parts
Replaceable Part Listings
Hardware, Preregulator
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
2110-1059
1
FUSE, T 5A 125V, UL LISTED/CSA CERTIFIED TO 248
STANDARD (for 115V operations)
2110-1036
1
FUSE, T 4A H 250V, BUILT TO IEC127-2/5 STANDARD (for
230V operations)
2
08753-00065
1
BRACKET-PREREGULATOR
3
0515-1400
2
SCREW-MACHINE M3.5×8 CW-FL-TX
A15
0950-3488
1
PREREGULATOR-ASSEMBLY
Figure 13-19
Chapter 13
Description
Hardware, Preregulator
13-33
Replaceable Parts
Replaceable Part Listings
Chassis Parts, Outside
Ref.
Desig.
HP/Agilent
Part Number
Qty
1
5041-9176
1
TRIM STRIP
2
08720-00078
1
COVER-TOP
3
5041-9188
4
REAR STANDOFF
4
0515-1402
4
SCREW SMM 3.5 8 PCPNTX
5
5041-9187
2
REAR CAP-SIDE STRAP
6
0515-1384
4
SCREW SMM 5.0 10 PCFLTX
7
08720-00081
2
SIDE STRAP
8
08720-00080
2
COVER-SIDE
9
5041-9186
2
FRONT CAP-SIDE STRAP
10
08720-00079
2
COVER-BOTTOM
11
1460-1345
2
FOOT ELEVATOR
12
5041-9167
4
FOOT
13
08753-80066
1
LABEL: CAUTION WARNING
14
08753-80174
1
LABEL: LOCATION DIAGRAM
15
08753-40015
1
LINE BUTTON
16
5041-9173
2
SIDE TRIM STRIP
13-34
Description
Chapter 13
Replaceable Parts
Replaceable Part Listings
Figure 13-20
Chapter 13
Chassis Parts, Outside
13-35
Replaceable Parts
Replaceable Part Listings
Chassis Parts, Inside
Ref.
Desig.
HP/Agilent
Part Number
Qty
Description
1
5022-1190
1
FRONT PANEL FRAME
2
5021-5808
1
REAR FRAME
3
08753-60936
1
ASSEMBLY-CARDCAGE/MOTHER
4
0515-2086
16
SCREW SMM4.0×7 PCFLTX
5
0515-0430
1
SCREW M3.0×6 CWPNTXa
6
08720-00083
1
INSULATOR SWITCHa
7
1460-1573
1
SPRING EXTENSION .138 OD
8
08720-00077
1
SWITCH RODa
9
0515-1400
1
SMM 3.5×8 PCFLTX
A17
08753-60360
1
BOARD ASSEMBLY-MOTHERBOARD
a. Part of CARDCAGE/MOTHER assembly (item 3).
Figure 13-21
13-36
Chassis Parts, Inside
Chapter 13
Replaceable Parts
Replaceable Part Listings
Miscellaneous
Description
HP/Agilent
Part Number
Service Tools
8753 TOOL KIT includes the following:
08753-60023
RF CABLE-INPUT R
08753-20028
EXTENDER BOARD ASSEMBLY-RECEIVER
08753-60019
EXTENDER BOARD ASSEMBLY-SOURCE
08753-60020
EXTENDER BOARD ASSEMBLY-CARD CAGE
08753-60155
EXTENDER BOARD ASSEMBLY-GSP
08753-60309
ADAPTER-MALE SMB TO MALE SMB
1250-0669
ADAPTER-MALE TYPE N TO FEMALE SMA
1250-1250
CABLE ASSEMBLY
5061-1022
BAG-ANTISTATIC 13×15
9222-1132
Documentation
Agilent Technologies 8753ET/ES and 8753ES Option 011 Manual Sets CD-ROM
- includes 8753ET/ES Manual Set (08753-90470) and 8753ES Option 011
Manual Set (08753-90477)
08753-90469
Agilent Technologies 8753ET/ES MANUAL SET includes the following:
08753-90470
8753ET/ES INSTALLATION/QUICK START GUIDE
08753-90471
8753ET/ES USER'S GUIDE
08753-90472
8753ET/ES REFERENCE GUIDE
08753-90473
8753ET/ES PROGRAMMER’S GUIDE (includes example programs on
CD-ROM)
08753-90475
Agilent Technologies 8753ES Option 011 Manual Set includes the following:
08753-90477
8753ES OPTION 011 INSTALLATION/QUICK START GUIDE
08753-90478
8753ES OPTION 011 USER'S GUIDE
08753-90479
8753ES OPTION 011 REFERENCE GUIDE
08753-90480
8753ES OPTION 011 PROGRAMMER’S GUIDE
08753-90475
Agilent Technologies 8753ET/ES and 8753ES Option 011 Service Documentation:
8753ET/ES SERVICE GUIDEa
08753-90484
8753ES OPTION 011 SERVICE GUIDEa
08753-90485
a. Includes the service guide CD-ROM (part number 08753-90504).
Chapter 13
13-37
Replaceable Parts
Replaceable Part Listings
Description
HP/Agilent Part or
Model Number
Agilent 8753ET Upgrade Kits
HARMONIC MEASUREMENT UPGRADE KIT
8753ETU OPT 002
STEP ATTENUATOR UPGRADE KIT
8753ETU OPT 004
6 GHz UPGRADE KIT
8753ETU OPT 006
TIME DOMAIN UPGRADE KIT
8753ETU OPT 010
FIRMWARE UPGRADE KIT
8753ETU OPT 099
HIGH-STABILITY FREQUENCY REFERENCE RETROFIT KIT
8753ETU OPT 1D5
Agilent 8753ES Upgrade Kits
HARMONIC MEASUREMENT UPGRADE KIT
8753ESU OPT 002
6 GHz UPGRADE KIT
8753ESU OPT 006
6 GHz UPGRADE KIT (for 8753ES Option 011)
8753ESU OPT 611
TIME DOMAIN UPGRADE KIT
8753ESU OPT 010
FIRMWARE UPGRADE KIT
8753ESU OPT 099
HIGH-STABILITY FREQUENCY REFERENCE RETROFIT KIT
8753ESU OPT 1D5
Protective Caps for Connectors
FEMALE GPIB CONNECTOR
1252-5007
FEMALE TEST SET I/O
1252-4690
FEMALE PARALLEL PORT
1252-4690
RS-232 CONNECTOR
1252-4697
7-mm TEST PORTS
1401-0249
FEMALE TYPE-N TEST PORTS (OPTIONS 011 AND 075)
1401-0247
13-38
Chapter 13
Replaceable Parts
Replaceable Part Listings
Description
HP/Agilent Part
or Model Number
Fuses used on the A8 Post Regulator
FUSE 0.5A 125V NON-TIME DELAY 0.25×0.27
2110-0046
FUSE 0.75A 125V NON-TIME DELAY 0.25×0.27
2110-0424
FUSE 1A 125V NON-TIME DELAY 0.25×0.27
2110-0047
FUSE 2A 125V NON-TIME DELAY 0.25×0.27
2110-0425
FUSE 4A 125V NON-TIME DELAY 0.25×0.27
2110-0476
For Line Fuse part numbers, refer to “Hardware, Preregulator” on page 13-33.
GPIB Cables
GPIB CABLE, 1M (3.3 FT)
10833A
GPIB CABLE, 2M (6.6 FT)
10833B
GPIB CABLE, 4M (13.2 FT)
10833C
GPIB CABLE, 0.5M (1.6 FT)
10833D
ESD Supplies
ADJUSTABLE ANTISTATIC WRIST STRAP
9300-1367
5 FT GROUNDING CORD for wrist strap
9300-0980
2 × 4 FT ANTISTATIC TABLE MAT WITH 15 FT GROUND WIRE
9300-0797
ANTISTATIC HEEL STRAP for use on conductive floors
9300-1126
Other
8753E KEYBOARD OVERLAY for external keyboard
08753-80131
RACK MOUNT KIT WITHOUT HANDLES
5063-9216
RACK MOUNT KIT WITH HANDLES
5063-9236
FRONT HANDLE
5063-9229
FLOPPY DISKS, 3.5 INCH DOUBLE-SIDED (box of 10)
92192A
Chapter 13
13-39
Replaceable Parts
Replaceable Part Listings
Table 13-1
Abbreviation Definitions
REFERENCE DESIGNATIONS
LCD........................................liquid crystal display
A................................................................Assembly
LED.........................................light-emitting diode
B...............................................................fan; motor
M...................................................................meters
J..........electrical connector (stationary portion); jack
M...............................................meteric hardware
RPG.........................................rotary pulse generator
MB.......................................................motherboard
W................................cable; transmission path; wire
MHz........................................................megahertz
ABBREVIATIONS
mm........................................................millimeters
A.......................................................................ampere
MON............................................................monitor
ALC.......................................automatic level control
NOM...........................................................nominal
ASSY.............................................................assembly
NY....................................................................nylon
AUX...............................................................auxiliary
OD.................................................outside diameter
BD.......................................................................board
Opt.................................................................option
COAX................................................................coaxial
OSC...........................................................oscillator
CPU.......................................central processing unit
PC..........................................................patch lock
CW........................................conical washer (screws)
PC....................................................printed circuit
D....................................................................diameter
PN...............................................panhead (screws)
ESD.........................................electrostatic discharge
REF...........................................................reference
EXT.................................................................external
REPL...................................................replacement
EYO.....................................................YIG oscillator
RP.........................................................rear panel
FL...................................................flathead (screws)
SH....................................socket head cap (screws)
FP............................................................front panel
TX.........................................TORX recess (screws)
FRAC-N..................................................fractional N
Qty..............................................................quantity
FREQ...........................................................frequency
V.........................................................................volt
GHz..............................................................gigahertz
WFR......................................................wire formed
GPIB.........................general purpose interface bus
W/O..............................................................without
HEX.............................................................hexagonal
YIG..........................................yttrium-iron garnet
HP.....................................................Hewlett-Packard
OPTIONS
HX...............................................hex recess (screws)
002..................................harmonics measurement
ID......................................................inside diameter
006............................................6 GHz performance
IF..........................................intermediate frequency
010.......................................................time domain
I/O............................................................input/output
011.......................................................w/o test set
kHz................................................................kilahertz
1D5........................................10 MHz precision ref
13-40
Chapter 13
14 Assembly Replacement and
Post-Repair Procedures
14-1
Assembly Replacement and Post-Repair Procedures
This chapter contains procedures for removing and replacing the major assemblies of the
analyzer. A table showing the corresponding post-repair procedures for each replaced
assembly is located at the end of this chapter.
14-2
Chapter 14
Assembly Replacement and Post-Repair Procedures
Replacing an Assembly
Replacing an Assembly
The following steps show the sequence to replace an assembly in the analyzer.
1. Identify the faulty group. Refer to Chapter 4 , “Start Troubleshooting Here.” Follow up
with the appropriate troubleshooting chapter that identifies the faulty assembly.
2. Order a replacement assembly. Refer to Chapter 13 , “Replaceable Parts.”
3. Replace the faulty assembly and determine what adjustments are necessary. Refer to
the information in this chapter.
4. Perform the necessary adjustments. Refer to Chapter 3 , “Adjustments and Correction
Constants.”
5. Perform the necessary performance tests. Refer to Chapter 2 , “Performance Tests.”
WARNING
These servicing instructions are for use by qualified personnel only.
To avoid electrical shock, do not perform any servicing unless you
are qualified to do so.
WARNING
The opening of covers or removal of parts is likely to expose
dangerous voltages. Disconnect the instrument from all voltage
sources while it is being opened.
WARNING
The power cord is connected to internal capacitors that may remain
live for 10 seconds after disconnecting the plug from its power
supply.
CAUTION
Many of the assemblies in this instrument are very susceptible to damage
from ESD (electrostatic discharge). Perform the following procedures only at
a static-safe workstation and wear a grounding strap.
Chapter 14
14-3
Assembly Replacement and Post-Repair Procedures
Replacing an Assembly
Procedures described in this chapter
The following pages describe assembly replacement procedures for the analyzer assemblies
listed below:
• Line Fuse on page 14-5
• Covers on page 14-6
• Front Panel Assembly on page 14-8
• Front Panel Keyboard and Interface Assemblies (A1, A2) on page 14-10
• Display, Display Lamp and Inverter Assemblies (A18, A27) on page 14-12
• Rear Panel Assembly on page 14-14
• Rear Panel Interface Board Assembly (A16) on page 14-16
• Type-N Connector Assembly on page 14-18
• A3 Source Assembly on page 14-20
• A4, A5, A6 Samplers and A7 Pulse Generator on page 14-22
• A8, A10, A11, A12, A13, A14 Card Cage Boards on page 14-24
• A9 CPU Board on page 14-26
• A9BT1 Battery on page 14-28
• A15 Preregulator on page 14-30
• A17 Motherboard Assembly on page 14-32
• A19 Graphics Processor on page 14-35
• A20 Disk Drive Assembly on page 14-36
• High Stability Frequency Reference (Option 1D5) Assembly on page 14-40
• B1 Fan Assembly on page 14-42
14-4
Chapter 14
Assembly Replacement and Post-Repair Procedures
Line Fuse
Line Fuse
Tools Required
• small slot screwdriver
Removal
WARNING
For continued protection against fire hazard, replace line fuse only
with same type and rating (115 V operation: T 5A 125V UL/CSA; 230V
operation: T 4A H 250V IEC). The use of other fuses or materials is
prohibited.
1. Refer to Figure 14-1.
2. Disconnect the power cord.
3. Use a small slot screwdriver to pry open the fuse holder.
4. Replace the failed fuse with one of the correct rating for the line voltage. See
“Hardware, Preregulator” on page 13-33 to locate the correct part number.
Replacement
1. Simply replace the fuse holder.
Figure 14-1
Chapter 14
Line Fuse
14-5
Assembly Replacement and Post-Repair Procedures
Covers
Covers
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• T-20 TORX screwdriver
• T-25 TORX screwdriver
Refer to Figure 14-2 when performing the following procedures.
Removing the top cover
1. Remove both upper rear feet (item 1) by loosening the attaching screws (item 2).
2. Loosen the top cover screw (item 3).
3. Slide the cover back and off.
Removing the side covers
1. Remove the top cover.
2. Remove the lower rear foot (item 4) that corresponds to the side cover you want to
remove by loosening the attaching screw (item 5).
3. Remove the handle assembly (item 6) by loosening the attaching screws (item 7).
4. Slide the cover back and off.
Removing the bottom cover
1. Remove both lower rear feet (item 4) by loosening the attaching screws (item 5).
2. Loosen the bottom cover screw (item 8).
3. Slide the cover back and off.
14-6
Chapter 14
Assembly Replacement and Post-Repair Procedures
Covers
Figure 14-2
Chapter 14
Covers
14-7
Assembly Replacement and Post-Repair Procedures
Front Panel Assembly
Front Panel Assembly
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• small slot screwdriver
• ESD (electrostatic discharge) grounding wrist strap
• 5/16-inch open-end torque wrench (set to 10 in-lb)
Refer to Figure 14-3 when performing the following procedures.
Removal
1. Disconnect the power cord.
2. Remove the front bottom feet (item 1).
3. Remove the line button (item 5) by pulling it out.
4. Remove the trim strip (item 3) from the top edge of the front frame by prying under the
strip with a small slot screwdriver.
5. Remove the six screws (item 2) from the top and bottom edges of the frame.
6. Slide the front panel over the test port connectors.
7. Disconnect the ribbon cable (item 4). The front panel is now free from the instrument.
Replacement
1. Reverse the order of the removal procedure.
NOTE
14-8
When reconnecting semirigid cables, it is recommended that the connections
be torqued to 10 in-lb.
Chapter 14
Assembly Replacement and Post-Repair Procedures
Front Panel Assembly
Figure 14-3
Chapter 14
Front Panel Assembly
14-9
Assembly Replacement and Post-Repair Procedures
Front Panel Keyboard and Interface Assemblies (A1, A2)
Front Panel Keyboard and Interface Assemblies (A1, A2)
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• small slot screwdriver
• ESD (electrostatic discharge) grounding wrist strap
• 5/16-inch open-end torque wrench (set to 10 in-lb)
Removal
1. Remove the front panel assembly from the analyzer (refer to “Front Panel Assembly” on
page 14-8).
2. Refer to Figure 14-4. Disconnect cables (items 4 and 7) by pulling up on the corners of
the connector base. This will release the cable for easy removal. Damage may occur to
the connector if this step is not followed.
3. Disconnect all other cables from the front panel interface board (items 1, 2, 3, and 6).
4. Remove the four screws (item 5) that secure the A2 interface board.
5. Remove the eight screws from the A1 front panel board to access and remove the rubber
keypad.
Replacement
1. Reverse the order of the removal procedure.
CAUTION
Damage may result if the following step is not followed.
2. To reconnect item 7, ensure that the ribbon cable is placed squarely into both of its cable
clamps.
14-10
Chapter 14
Assembly Replacement and Post-Repair Procedures
Front Panel Keyboard and Interface Assemblies (A1, A2)
Figure 14-4
Chapter 14
Front Panel Keyboard and Interface Assemblies
14-11
Assembly Replacement and Post-Repair Procedures
Display, Display Lamp and Inverter Assemblies (A18, A27)
Display, Display Lamp and Inverter Assemblies
(A18, A27)
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• small slot screwdriver
• ESD (electrostatic discharge) grounding wrist strap
• #0 Phillips Screwdriver
Removal
1. Remove the front panel assembly (refer to “Front Panel Assembly” on page 14-8).
2. Refer to Figure 14-5. Disconnect the cables (items 2, 3 and 4) by performing the
following steps:
a. Disconnect cable (item 2) from the inverter (A27). Slip item 2 out of both of its cable
clamps.
b. Disconnect item 4 from the inverter (A27).
c. Disconnect item 3 from the keyboard interface board (A2).
3. Remove the two screws (item 8) that attach the inverter (A27) and inverter cover (A28)
to the mounting plate (item 7). Note that this also allows the inverter cover to be
separated from the inverter.
4. Remove the three screws (item 1) along the bottom edge of the mounting plate.
5. Swing the bottom edge of the mounting plate up as shown, then pull it away from the
display. The display can now be removed from the front panel.
NOTE
The bottom half of Figure 14-5 depicts the rear view of the A18 assembly with
the mounting plate removed. Use the location of the display lamp cable
(item 4) to aid in orientation.
6. Remove the two screws (item 5) that attach the lamp to the display. Detach the lamp
from the display by pulling it down, then up, as shown.
Replacement
1. Reverse the order of the removal procedure.
2. Be sure to route ribbon cable 2 through both cable clamps.
14-12
Chapter 14
Assembly Replacement and Post-Repair Procedures
Display, Display Lamp and Inverter Assemblies (A18, A27)
CAUTION
Be sure that cables are plugged in square and correct. Failure to do so will
result in serious component damage.
CAUTION
Do not exceed 10 in-lb when replacing the display hold-down plate screws.
Figure 14-5
Chapter 14
Display, Display Lamp and Inverter Assemblies
14-13
Assembly Replacement and Post-Repair Procedures
Rear Panel Assembly
Rear Panel Assembly
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord and remove the top (item 1) and bottom covers (refer to
“Covers” on page 14-6).
2. Refer to Figure 14-6. Remove the four rear standoffs (item 2).
3. If the analyzer has option 1D5, remove the BNC jumper from the high stability
frequency reference (item 3).
4. Remove the four screws (item 5) that attach the interface bracket to the rear panel.
5. Remove the six screws (items 6 and 7) that attach the preregulator to the rear panel.
6. Remove the six screws (item 8) from the rear frame: two from the top edge, and four
from the bottom edge.
7. Remove the screw from the pc board stabilizer (item 9) and remove the stabilizer.
8. Lift the reference board (A12) from its motherboard connector and disconnect the
flexible RF cable from its connector on A12 (item 10).
9. Identify the wiring harness leading to the VGA connector (item 4). Follow this harness
back to its connection on the motherboard. The air flow cover, attached by two screws,
will have to be removed to get to this connection. Disconnect the VGA wire harness at
this point.
10.Pull the rear panel away from the frame. Disconnect the ribbon cable (item 11) from the
motherboard connector, pressing down and out on the connector locks. Disconnect the
wiring harness (item 12) from the motherboard.
Replacement
1. Reverse the order of the removal procedure.
14-14
Chapter 14
Assembly Replacement and Post-Repair Procedures
Rear Panel Assembly
Figure 14-6
Chapter 14
Rear Panel Assembly
14-15
Assembly Replacement and Post-Repair Procedures
Rear Panel Interface Board Assembly (A16)
Rear Panel Interface Board Assembly (A16)
Tools Required
• 9/16 hex nut driver
• 3/16 hex nut driver
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord and remove the top and bottom covers (refer to “Covers” on
page 14-6).
2. If the analyzer has option 1D5, remove the high-stability frequency reference jumper
(item 1).
3. Remove the hardware that attaches the five BNC connectors to the rear panel (item 2).
4. Remove the hardware that attaches the interface connector to the rear panel (item 3).
5. Remove the rear panel from the analyzer (refer to “Rear Panel Assembly” on
page 14-14).
6. If the analyzer has option 1D5, disconnect the cable (item 5) from the rear panel
interface board.
7. Disconnect the ribbon cable (item 6) from the rear panel interface board.
Replacement
1. Reverse the order of the removal procedure.
14-16
Chapter 14
Assembly Replacement and Post-Repair Procedures
Rear Panel Interface Board Assembly (A16)
Figure 14-7
Chapter 14
Rear Panel Interface Board Assembly
14-17
Assembly Replacement and Post-Repair Procedures
Type-N Connector Assembly
Type-N Connector Assembly
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• small slot screwdriver
• ESD (electrostatic discharge) grounding wrist strap
• 5/16-inch open-end torque wrench (set to 10 in-lb)
Removal
1. Disconnect the power cord.
2. Remove the front panel (refer to “Front Panel Assembly” on page 14-8).
3. Remove the right-side trim strip (item 1) from the front frame. Remove the screw
(item 2) that secures the right end of the type-N connector bracket.
4. Remove the three screws (item 3) from the bottom edge of the front frame that secure
the connector bracket.
5. Disconnect the semirigid cables (W1, W2, W3, and W4) from the type-N connector
assembly.
6. Remove the connector assembly (item 4).
Replacement
1. Reverse the order of the removal procedure.
NOTE
14-18
When reconnecting semirigid cables, it is recommended that the connections
be torqued to 10 in-lb.
Chapter 14
Assembly Replacement and Post-Repair Procedures
Type-N Connector Assembly
Figure 14-8
Chapter 14
Type-N Connector Assembly
14-19
Assembly Replacement and Post-Repair Procedures
A3 Source Assembly
A3 Source Assembly
Tools Required
• T-15 TORX screwdriver
• 5/16-inch open-end torque wrench (set to 10 in-lb)
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord and remove the top cover (refer to “Covers” on page 14-6).
2. Remove the source bracket (item 1) by removing four screws. (It might be necessary to
disconnect a flexible cable from the B sampler.)
3. Disconnect the semirigid cable W1.
4. Lift the two retention clips (item 2) at the sides of the source assembly to an upright
position.
5. Move W1 to the front while lifting the source high enough to clear it. To lift the A3
source assembly, use the source bracket handle (item 3).
6. Remove the source assembly from the instrument.
Replacement
1. Check the connector pins on the motherboard before reinstallation.
2. Slide the edges of the sheet metal partition (item 4) into the guides at the front and
back of the source compartment. Press down on the module to ensure that it is well
seated in the motherboard connector.
3. Push down the retention clips. Reconnect the semirigid cable W1.
NOTE
When reconnecting semirigid cables, it is recommended that the connections
be torqued to 10 in-lb.
4. Reinstall the source bracket.
5. Reconnect the flexible cable to the B sampler.
14-20
Chapter 14
Assembly Replacement and Post-Repair Procedures
A3 Source Assembly
Figure 14-9
Chapter 14
Source Assembly, A3
14-21
Assembly Replacement and Post-Repair Procedures
A4, A5, A6 Samplers and A7 Pulse Generator
A4, A5, A6 Samplers and A7 Pulse Generator
Tools Required
• Needle-nose pliers
• T-10 TORX screwdriver
• 5/16-inch open-end torque wrench (set to 10 in-lb)
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord and remove the top cover (refer to “Covers” on page 14-6).
2. To remove the B sampler (A6), you must remove the source bracket (item 1).
3. Disconnect all cables from the top of the sampler (A4/A5/A6) or pulse generator (A7).
4. Remove the screws from the top of each sampler assembly. Extract the assembly from
the slot.
NOTE
To remove the A (A5) or R (A4) sampler, first remove the cable on the B (A6)
sampler.
NOTE
If you are removing the pulse generator (A7), the grounding clip, which rests
on top of the assembly, will become loose once the four screws are removed. Be
sure to replace the grounding clip when reinstalling the pulse generator
assembly.
Replacement
1. Check the connector pins on the motherboard before reinstallation.
2. Reverse the order of the removal procedure.
NOTE
When reconnecting semirigid cables, it is recommended that the connections
be torqued to 10 in-lb.
Be sure to route W8 and W9 as shown. No excess wire should be hanging in
the A11 and A14 board slots. Routing the wires in this manner will reduce
noise and crosstalk.
14-22
Chapter 14
Assembly Replacement and Post-Repair Procedures
A4, A5, A6 Samplers and A7 Pulse Generator
Figure 14-10
A4, A5, A6 Samplers and A7 Pulse Generator
Cable connections
for A7 Pulse Generators
produced after 01 July 2004.
Chapter 14
14-23
Assembly Replacement and Post-Repair Procedures
A8, A10, A11, A12, A13, A14 Card Cage Boards
A8, A10, A11, A12, A13, A14 Card Cage Boards
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord and remove the top cover (refer to “Covers” on page 14-6).
2. Remove the screw from the pc board stabilizer and remove the stabilizer.
3. Lift the two extractors located at each end of the board. Lift the board from the card
cage slot, just enough to disconnect any flexible cables that may be connected to it.
4. Remove the board from the card cage slot.
Replacement
1. Check the connector pins on the motherboard before reinstallation.
2. Reverse the order of the removal procedure.
NOTE
14-24
Be sure to route W8 and W9 as shown. No excess wire should be hanging in
the A11 and A14 board slots. Routing the wires in this manner will reduce
noise and crosstalk in the instrument.
Chapter 14
Assembly Replacement and Post-Repair Procedures
A8, A10, A11, A12, A13, A14 Card Cage Boards
Figure 14-11
Chapter 14
Card Cage Boards: A8, A10, A11, A12, A13, A14
14-25
Assembly Replacement and Post-Repair Procedures
A9 CPU Board
A9 CPU Board
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord.
2. Remove the top and bottom covers (refer to “Covers” on page 14-6).
3. Remove the rear panel assembly, following steps 2 through 6 of “Rear Panel Assembly”
on page 14-14.
4. Turn the analyzer upside down.
5. Pull the rear panel away from the frame.
6. Disconnect the four ribbon cables (W20, W35, W36, and W37) from the CPU board (A9).
7. Remove the three screws (item 2) that secure the CPU board (A9) to the deck. Slide the
board towards the front of the instrument so that it disconnects from the three standoffs
(item 3).
8. Lift the board off of the standoffs.
Replacement
1. Reverse the order of the removal procedure.
2. Leave the bottom cover off in order to perform the post repair procedures located at the
end of this chapter.
14-26
Chapter 14
Assembly Replacement and Post-Repair Procedures
A9 CPU Board
Figure 14-12
Chapter 14
A9 CPU Board
14-27
Assembly Replacement and Post-Repair Procedures
A9BT1 Battery
A9BT1 Battery
Tools Required
• T-10 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
• soldering iron with associated soldering tools
Removal
1. Remove the A9 CPU board (refer to “A9 CPU Board” on page 14-26).
2. Unsolder and remove A9BT1 from the A9 CPU board.
WARNING
Battery A9BT1 contains lithium. Do not incinerate or puncture this
battery. Dispose of the discharged battery in a safe manner.
Replacement
1. Make sure the new battery is inserted into the A9 board with the correct polarity.
WARNING
Danger of explosion if battery is incorrectly replaced. Replace only
with the same or equivalent type recommended.
2. Solder the battery into place.
3. Replace the A9 CPU board (refer to “A9 CPU Board” on page 14-26).
14-28
Chapter 14
Assembly Replacement and Post-Repair Procedures
A9BT1 Battery
Figure 14-13
Chapter 14
A9BT1 Battery
14-29
Assembly Replacement and Post-Repair Procedures
A15 Preregulator
A15 Preregulator
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Remove the rear panel (refer to “Rear Panel Assembly” on page 14-14).
2. Remove the two remaining screws from the top of the rear frame.
3. Disconnect the wire bundle (A15W1) from A8J2 and A17J3.
4. Remove the preregulator (A15) from the frame.
Replacement
1. Reverse the order of the removal procedure.
NOTE
When reinstalling the preregulator (A15), make sure the three grommets
(item 1) on A15W1 are seated in the two slots (item 2) on the back side of the
preregulator and the slot (item 3) in the card cage wall.
After reinstalling the preregulator (A15), be sure to set the line voltage
selector to the appropriate setting, 115 V or 230 V.
14-30
Chapter 14
Assembly Replacement and Post-Repair Procedures
A15 Preregulator
Figure 14-14
Chapter 14
A15 Preregulator
14-31
Assembly Replacement and Post-Repair Procedures
A17 Motherboard Assembly
A17 Motherboard Assembly
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• T-20 TORX screwdriver
• small slot screwdriver
• 2.5-mm hex-key driver
• 5/16-inch open-end torque wrench (set to 10 in-lb)
• ESD (electrostatic discharge) grounding wrist strap
Removal
To remove the A17 motherboard assembly only, perform the following steps to remove all
assemblies and cables that connect to the motherboard.
1. Disconnect the power cord and remove the top, bottom, and side covers (refer to
“Covers” on page 14-6).
2. Remove the front panel assembly (refer to “Front Panel Assembly” on page 14-8).
3. Remove the rear panel assembly (refer to “Rear Panel Assembly” on page 14-14).
4. Remove the preregulator (refer to “A15 Preregulator” on page 14-30).
5. Remove the graphics processor (refer to “A19 Graphics Processor” on page 14-35).
6. Remove the CPU board (refer to “A9 CPU Board” on page 14-26).
7. Remove the memory deck (item 1) by removing three screws (item 2) from the bottom
and four screws (item 4) from the side frames.
8. Remove the source assembly (refer to “A3 Source Assembly” on page 14-20).
9. Remove the samplers and pulse generator (refer to “A4, A5, A6 Samplers and A7 Pulse
Generator” on page 14-22).
10.Remove the card cage boards (refer to “A8, A10, A11, A12, A13, A14 Card Cage Boards”
on page 14-24).
11.Remove the motherboard support bracket (item 3). Continue with step 12 to remove the
motherboard, or step 13 to remove the motherboard/card cage assembly.
12.To disconnect the motherboard (item 7), remove the 34 riv screws (item 8). Important:
Do not misplace any of these screws.
14-32
Chapter 14
Assembly Replacement and Post-Repair Procedures
A17 Motherboard Assembly
Figure 14-15
Chapter 14
A17 Motherboard Assembly
14-33
Assembly Replacement and Post-Repair Procedures
A17 Motherboard Assembly
To remove the A17 motherboard assembly along with the card cage, continue with the
following step:
13.Refer to Figure 14-16. Remove the front frame (item 1) and rear frame (item 6) by
removing the attaching screws (item 7). At this point, only the motherboard/card cage
assembly should remain. This whole assembly is replaceable.
Figure 14-16
A17 Motherboard and Card Cage Assembly
Replacement
1. Reverse the order of the removal procedure.
14-34
Chapter 14
Assembly Replacement and Post-Repair Procedures
A19 Graphics Processor
A19 Graphics Processor
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Disconnect the power cord.
2. Remove the top cover (refer to “Covers” on page 14-6) and front panel (refer to “Front
Panel Assembly” on page 14-8).
3. Remove the six screws (item 1) from the GSP cover (item 2) and lift off.
4. Swing out the handles (item 3) and pull the GSP board (item 4) out of the analyzer.
Replacement
1. Check the connector pins on the motherboard before reinstallation.
2. Reverse the order of the removal procedure.
Figure 14-17
Chapter 14
A19 Graphics Processor
14-35
Assembly Replacement and Post-Repair Procedures
A20 Disk Drive Assembly
A20 Disk Drive Assembly
Tools Required
• T-8 TORX screwdriver
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• T-25 TORX screwdriver
• #2 ball-end hex driver with long shaft
• ESD (electrostatic discharge) grounding wrist strap
• 3.5” diskette
Removal
1. Disconnect the power cord and remove the top, bottom, and left side covers (“Covers” on
page 14-6).
NOTE
The next step instructs you to disconnect a ribbon cable from its connector on
the CPU board. Figure 14-18 depicts the location of the connector (item 1).
2. Turn the analyzer onto its right side and gently pull up on each end of the connector
body to release the disk drive ribbon cable (item 1 of Figure 14-18) from the CPU board.
3. Remove the four screws (item 2) that secure the disk drive bracket to the analyzer
chassis.
NOTE
Save the screws removed in this step for installing the replacement disk
drive.
4. Slide the disk drive—with the attached cable—out of the top of the instrument.
5. Disconnect the ribbon cable from the disk drive by gently pulling up on each end of the
connector body to release the ribbon cable.
6. Remove the three screws (item 3) that secure the bracket to the disk drive.
7. Remove the plug (item 4) from the disk drive.
14-36
Chapter 14
Assembly Replacement and Post-Repair Procedures
A20 Disk Drive Assembly
Figure 14-18
Chapter 14
A20 Disk Drive Assembly
14-37
Assembly Replacement and Post-Repair Procedures
A20 Disk Drive Assembly
A20 Disk Drive Assembly Replacement
1. Attach the plug (item 4) to the replacement disk drive.
2. Attach the disk drive bracket to the replacement disk drive as shown. Leave the three
screws loose in case the disk drive ’s position needs to be adjusted.
NOTE
Place the disk drive on a horizontal and flat surface when attaching the
bracket. This minimizes distortion of the disk drive.
3. Connect the disk drive ribbon cable to the replacement disk drive.
NOTE
In steps 3 and 5, make sure that the connector-contacts on both the disk drive
and the CPU touch the ribbon cable contact areas (the ribbon-cable contact
areas must face the contacts in the disk drive and CPU connectors). Also
assure that the connector is properly locked by gently pushing down on the
ends of the connector body.
4. Slide the disk drive assembly into the analyzer. Align the disk drive door with the
opening in the front panel. Attach it to the analyzer frame using the four screws from
step 3 of the “Removal” procedure.
5. Route the ribbon cable through the side access hole. Avoid twisting the cable: duplicate
the original folds made to the cable. Connect the disk drive cable to the CPU board.
Refer to item 1 in Figure 14-18. Secure the ribbon cable to its clamp on the test set deck.
6. Remove the trim strip from the top of the front panel.
7. Remove the top left screw located under the trim strip.
8. Tighten the three screws (item 3) that fasten the disk drive to the bracket. The top
front-most screw is accessed through the exposed screw-hole under the trim strip.
14-38
Chapter 14
Assembly Replacement and Post-Repair Procedures
A20 Disk Drive Assembly
Test the disk-eject function, and adjust if required.
1. Insert a diskette into the disk drive and then eject the disk.
2. If the diskette does not eject properly, loosen and then retighten the three screws that
hold the disk drive to the disk drive bracket:
a. Loosen the three screws that are readily accessible.
b. Loosen the upper-most front screw through the screw hole left empty in step 7 on
page 14-38.
c. Center the disk drive in the opening.
d. Retighten all three screws.
Reinstall the front panel and covers
1. Reinstall the top left screw under the trim strip.
2. Reinstall the trim strip.
3. Reinstall the covers. If necessary, refer to “Front Panel Assembly” on page 14-8 for help
with this task.
Chapter 14
14-39
Assembly Replacement and Post-Repair Procedures
High Stability Frequency Reference (Option 1D5) Assembly
High Stability Frequency Reference (Option 1D5)
Assembly
Tools Required
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• 9/16-inch hex-nut driver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Remove the rear panel (refer to “Rear Panel Assembly” on page 14-14).
2. Disconnect W30 from the high stability frequency reference board (A26).
3. Remove the BNC connector nut and washer from the 10 MHz PRECISION
REFERENCE connector (item 1) on the rear panel.
4. Remove the screw (item 4) that attaches the 1D5 assembly to the rear panel.
5. Remove the screw (item 2) that secures the high stability frequency reference board
(A26) to the bracket.
6. Slide the board out of the bracket. Be careful not to lose the plastic spacer washer
(item 3) that is on the BNC connector as the board is being removed.
Replacement
1. Reverse the order of the removal procedure.
NOTE
Before reinserting the high stability frequency reference board (A26) into the
bracket, be sure the plastic spacer washer (item 3) is on the BNC connector.
14-40
Chapter 14
Assembly Replacement and Post-Repair Procedures
High Stability Frequency Reference (Option 1D5) Assembly
Figure 14-19
Chapter 14
A26 High Stability Frequency Reference (Option 1D5) Assembly
14-41
Assembly Replacement and Post-Repair Procedures
B1 Fan Assembly
B1 Fan Assembly
Tools Required
• 2.5-mm hex-key driver
• T-10 TORX screwdriver
• T-15 TORX screwdriver
• ESD (electrostatic discharge) grounding wrist strap
Removal
1. Remove the rear panel (refer to “Rear Panel Assembly” on page 14-14).
2. Remove the four screws (item 1) that secure the fan and fan cover to the rear panel.
Replacement
1. Reverse the order of the removal procedure.
NOTE
The fan should be installed so that the direction of the air flow is away from
the instrument. There is an arrow on the fan chassis indicating the air flow
direction.
Figure 14-20
14-42
B1 Fan Assembly
Chapter 14
Assembly Replacement and Post-Repair Procedures
Post-Repair Procedures
Post-Repair Procedures
Table 3-1 on page 3-3 lists the additional service procedures that must be performed to
ensure that the analyzer is working correctly, following the replacement of an assembly.
Perform the procedures in the order that they are listed in the table.
Chapter 14
14-43
Assembly Replacement and Post-Repair Procedures
Post-Repair Procedures
14-44
Chapter 14
15 Safety and Regulatory Information
15-1
Safety and Regulatory Information
General Information
General Information
Maintenance
Clean the cabinet, using a dry or damp cloth only.
WARNING
To prevent electrical shock, disconnect the analyzer from mains
before cleaning. Use a dry cloth or one slightly dampened with water
to clean the external case parts. Do not attempt to clean internally.
Lithium Battery Disposal
If the battery on the CPU board (A9) needs to be disposed of, dispose of it in accordance
with your country’s requirements. If required, you may return the battery to Agilent
Technologies for disposal. Refer to “Contacting Agilent” on page 15-3 for assistance.
Assistance
Product maintenance agreements and other customer assistance agreements are available
for Agilent Technologies products.
For any assistance, contact your nearest Agilent Technologies Sales and Service Office. Refer
to “Contacting Agilent” on page 15-3.
Shipment for Service
If you are sending the instrument to Agilent Technologies for service, ship the analyzer to
the nearest Agilent service center for repair. (Refer to “Contacting Agilent” on page 15-3.)
Include a description of any failed test and any error message. Ship the analyzer using the
original or comparable antistatic packaging materials.
15-2
Chapter 15
Safety and Regulatory Information
General Information
Contacting Agilent
Online assistance: www.agilent.com/find/assist
Americas
Brazil
(tel) (+55) 11 4197 3700
(fax) (+55) 11 4197 3800
Canada
(tel) 888 447 7378
Mexico
(tel) 1 800 734 7703
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United States
(tel) 800 829 4444
(alt) (+1) 303 662 3998
(fax) 800 829 4433
Australia
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(alt) 1 800 893 449
(fax) 1 800 681 776
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(tel) 800 810 0508
(alt) 800 810 0510
(fax) 800 810 0507
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Hong Kong
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(fax) 800 900 701
India
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(fax) 1600 112 727
(fax) 1600 113 040
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Japan (On-Site)
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(alt) (+81) 426 56 7498
(fax) (+81) 426 60 8953
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(tel) 1 800 275 0880
(fax) (+65) 6836 0240
(fax) (+65) 6755 1235
(fax) (+65) 6755 1214
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(tel) 080 770 7774
(tel) 080 778 0011
(tel) 080 778 0012
(alt) +65 270 1207
(fax) 080 778 0013
(fax) +82 080 778-0014
(fax) 080 770 7778
Taiwan
(tel) 0800 047 661
(tel) 0800 047 669
(fax) 0800 047 667
Thailand
(tel) 1 800 2758 5822
(alt) (+66) 259 3442
(fax) 1 800 656 336
Malaysia
(tel) 1800 880 399
(fax) 1800 801 054
Asia Pacific and Japan
Europe
Finland
(tel) (+358) 10 855 2100
(fax) (+358) 10 855 2923
Austria
(tel) 0820 87 44 11*
(fax) 0820 87 44 22
Belgium
(tel) (+32) (0)2 404 9340
(alt) (+32) (0)2 404 9000
(fax) (+32) (0)2 404 9395
Denmark
(tel) (+45) 7013 1515
(alt) (+45) 7013 7313
(fax) (+45) 7013 1555
France
(tel) 0825 010 700*
(alt) (+33) (0)1 6453 5623
(fax) 0825 010 701*
Germany
(tel) 01805 24 6333*
(alt) 01805 24 6330*
(fax) 01805 24 6336*
Israel
Ireland
(tel) (+353) (0)1 890 924 204 (tel) (+972) 3 9288 500
(alt) (+353) (0)1 890 924 206 (fax) (+972) 3 9288 501
(fax)(+353) (0)1 890 924 024
Italy
(tel) (+39) (0)2 9260 8484
(fax) (+39) (0)2 9544 1175
Luxemburg
(tel) (+32) (0)2 404 9340
(alt) (+32) (0)2 404 9000
(fax) (+32) (0)2 404 9395
Netherlands
(tel) (+31) (0)20 547 2111
(alt) (+31) (0)20 547 2000
(fax) (+31) (0)20 547 2190
Russia
(tel) (+7) 095 797 3963
(alt) (+7) 095 797 3900
(fax) (+7) 095 797 3901
Spain
(tel) (+34) 91 631 3300
(alt) (+34) 91 631 3000
(fax) (+34) 91 631 3301
Sweden
(tel) 0200 88 22 55*
(alt) (+46) (0)8 5064 8686
(fax) 020 120 2266*
Switzerland (French)
(tel) 0800 80 5353 opt. 2*
(alt) (+33) (0)1 6453 5623
(fax) (+41) (0)22 567 5313
Switzerland (German)
(tel) 0800 80 5353 opt. 1*
(alt) (+49) (0)7031 464 6333
(fax) (+41) (0)1 272 7373
Switzerland (Italian)
(tel) 0800 80 5353 opt. 3*
(alt) (+39) (0)2 9260 8484
(fax) (+41) (0)22 567 5314
United Kingdom
(tel) (+44) (0)7004 666666
(alt) (+44) (0)7004 123123
(fax) (+44) (0)7004 444555
(tel) = primary telephone number; (alt) = alternate telephone number; (fax) = FAX number; * = in country number
Chapter 15
5/04
15-3
Safety and Regulatory Information
Instrument Markings
Instrument Markings
The instruction documentation symbol. The product is marked with this
symbol when it is necessary for the user to refer to the instructions in the
documentation.
The CE mark is a registered trademark of the European Community. (If
accompanied by a year, it is when the design was proven.)
The CSA mark is a registered trademark of the Canadian Standards
Association.
This is a symbol of an Industrial Scientific and Medical Group 1 Class A
product.
ICES / NMB-001
This is a marking to indicate product compliance with the Canadian
Interference-Causing Equipment Standard (ICES-001).
The C-Tick mark is a registered trademark of the Australian Spectrum
Management Agency.
Compliance with German FTZ Emissions Requirements
This network analyzer complies with German FTZ 526/527 Radiated Emissions and
Conducted Emission requirements.
Compliance with German Noise Requirements
This is to declare that this instrument is in conformance with the German Regulation on
Noise Declaration for Machines (Laermangabe nach der Maschinenlaermrerordnung−3.
GSGV Deutschland).
Acoustic Noise Emission/Geraeuschemission
LpA <70 dB
Lpa <70 dB
Operator Position
am Arbeitsplatz
Normal Operation
normaler Betrieb
per ISO 7779
nach DIN 45635 t. 19
15-4
Chapter 15
Safety and Regulatory Information
Safety Symbols
Safety Symbols
The following safety symbols are used throughout this manual. Familiarize yourself with
each of the symbols and its meaning before operating this instrument.
CAUTION
Caution denotes a hazard. It calls attention to a procedure that, if not
correctly performed or adhered to, would result in damage to or destruction of
the instrument. Do not proceed beyond a caution note until the indicated
conditions are fully understood and met.
WARNING
Warning denotes a hazard. It calls attention to a procedure which, if
not correctly performed or adhered to, could result in injury or loss
of life. Do not proceed beyond a warning note until the indicated
conditions are fully understood and met.
Safety Considerations
NOTE
This instrument has been designed and tested in accordance with IEC
Publication 1010, Safety Requirements for Electronics Measuring Apparatus,
and has been supplied in a safe condition. This instruction documentation
contains information and warnings which must be followed by the user to
ensure safe operation and to maintain the instrument in a safe condition.
Safety Earth Ground
WARNING
This is a Safety Class I product (provided with a protective earthing
ground incorporated in the power cord). The mains plug shall only
be inserted in a socket outlet provided with a protective earth
contact. Any interruption of the protective conductor, inside or
outside the instrument, is likely to make the instrument dangerous.
Intentional interruption is prohibited.
WARNING
Always use the three-prong AC power cord supplied with this
product. Failure to ensure adequate earth grounding by not using
this cord may cause product damage.
Chapter 15
15-5
Safety and Regulatory Information
Safety Considerations
Before Applying Power
CAUTION
The front panel LINE switch disconnects the mains circuits from the mains
supply after the EMC filters and before other parts of the instrument.
CAUTION
Before switching on this instrument, make sure that the analyzer line voltage
selector switch is set to the voltage of the power supply and the correct fuse is
installed.
CAUTION
If this product is to be energized via an autotransformer make sure the
common terminal is connected to the neutral (grounded side of the mains
supply).
General
WARNING
To prevent electrical shock, disconnect the analyzer from mains
before cleaning. Use a dry cloth or one slightly dampened with water
to clean the external case parts. Do not attempt to clean internally.
WARNING
If this product is not used as specified, the protection provided by
the equipment could be impaired. This product must be used in a
normal condition (in which all means for protection are intact) only.
CAUTION
This product is designed for use in Installation Category II and Pollution
Degree 2 per IEC 1010 and 664 respectively.
CAUTION
VENTILATION REQUIREMENTS: When installing the product in a cabinet,
the convection into and out of the product must not be restricted. The ambient
temperature (outside the cabinet) must be less than the maximum operating
temperature of the product by 4° C for every 100 watts dissipated in the
cabinet. If the total power dissipated in the cabinet is greater that 800 watts,
then forced convection must be used.
WARNING
Install the instrument according to the enclosure protection
provided. This instrument does not protect against the ingress of
water. This instrument protects against finger access to hazardous
parts within the enclosure.
15-6
Chapter 15
Safety and Regulatory Information
Safety Considerations
Servicing
WARNING
No operator serviceable parts inside. Refer servicing to qualified
personnel. To prevent electrical shock, do not remove covers.
WARNING
These servicing instructions are for use by qualified personnel only.
To avoid electrical shock, do not perform any servicing unless you
are qualified to do so.
WARNING
The opening of covers or removal of parts is likely to expose
dangerous voltages. Disconnect the instrument from all voltage
sources while it is being opened.
WARNING
Adjustments described in this document may be performed with
power supplied to the product while protective covers are removed.
Energy available at many points may, if contacted, result in personal
injury.
WARNING
Danger of explosion if battery is incorrectly replaced. Replace only
with the same or equivalent type recommended. Discard used
batteries according to manufacturer’s instructions.
WARNING
The power cord is connected to internal capacitors that may remain
live for 10 seconds after disconnecting the plug from its power
supply.
WARNING
For continued protection against fire hazard, replace line fuse only
with same type and rating (115 V operation: T 5A 125V UL/CSA; 230V
operation: T 4A H 250V IEC). The use of other fuses or materials is
prohibited.
Chapter 15
15-7
Safety and Regulatory Information
Safety Considerations
15-8
Chapter 15
Index
Symbols
+0.37 V reference, 10-29
+2.50 V reference, 10-29
+5 V digital supply
theory of operation, 12-7
Numerics
002, harmonic mode option, 1-6
006, 6 GHz option, 1-6
010, time domain option, 1-6
10 MHz HI OUT Waveform from
A14J1, 7-21
100 kHz
pulses, 7-14
reference frequency, 10-35
1CM, rack mount flange kit
without handles option, 1-6
1CP, rack mount flange kit with
handles option, 1-6
1D5, high stability frequency
reference option, 1-6
1st IF, 10-33
1st LO signal at sampler/mixer,
8-12
25 MHz HI OUT Waveform from
A14J1, 7-21
2nd IF (4 kHz) signal locations,
8-11
2nd LO, 10-37
2nd LO locations, 8-13
2nd LO waveforms, 7-17
4 kHz signal check, 8-11
4 MHz REF signal check, 8-8
4 MHz reference signal, 7-16
60 MHz HI OUT Waveform from
A14J1, 7-22
A
A1/A2 front panel
troubleshooting, 6-12
A3 ground, 10-28
A3 source and A11 phase lock
check, 7-8
A3 source assembly, 14-20
A4 sampler/mixer check, 7-8
A4,A5,A6 samplers, 14-22
A7 pulse generator, 14-22
A7 pulse generator check, 7-25
A8 post regulator LEDs, 4-11
A8, A10-A14 card cage boards,
14-24
A9 CPU board, 14-26
A9 CPU operation check, 6-5
A9BT1 battery, 14-28
A10
assembly signals required, 8-9
Index
check by substitution or signal
examination, 8-9
digital IF, 10-28, 12-30
ground reference, 10-29
A11 phase lock, 10-29
and A3 source check, 7-8
check, 7-28
input signals, 7-29
A12 reference, 10-35
check, 7-12
digital control signals check,
7-18
A13/A14 Fractional-N Check,
7-20
A14
divide-by-N circuit check, 7-23
fractional-N (digital), 10-38
generated digital control
signals, 7-24
-to-A13 digital control signals
check, 7-23
VCO exercise, 7-22
A15 plug detail, 5-11
A15 preregulator, 14-30
A16 interface board assembly,
14-16
A17 motherboard assembly, 14-32
A19 graphics processor, 14-35
abbreviation definitions, 13-40
ABUS correction constants, 10-12
ABUS test, 10-10
accessories error messages, 4-19
accessories troubleshooting, 9-1
accessory inspection, 9-4
accuracy of frequency adjustment,
3-42
accuracy, frequency, 2-4
accuracy, power, 2-6
ADC, 10-20
Hist., 10-10
linearity, 10-9
main, 10-20
offset, 10-9
offset correction, 10-12
offset correction constants
adjustment, 3-18
ADD, 10-7
addresses for GPIB systems, 4-8
adjustment
A9 switch positions, 3-6
ADC offset correction constants
(test 52), 3-18
analog bus correction constants
(test 46), 3-9
cavity oscillator frequency
correction constants (test
54), 3-25
fractional-N frequency range,
3-39
fractional-N spur avoidance and
FM sideband, 3-47
frequency accuracy, 3-42
high/low band transition, 3-45
IF amplifier correction
constants (test 51), 3-16
initialize EEPROM’s (test 58),
3-32
option numbers correction
constants (test 56), 3-31
RF output power correction
constants (test 47), 3-11
sampler magnitude and phase
correction constants (test
53), 3-19
sequences for mechanical
adjustments, 3-53
serial number correction
constants (test 55), 3-30
source
default correction constants
(test 44), 3-7
pretune default correction
constants (test 45), 3-8
spur avoidance tracking, 3-50
source pretune correction
constants (test 48), 3-10
tests, 10-4, 10-6, 10-12
adjustments, 3-1
ALC leveling integrator output,
10-27
ALC ON OFF, 10-17
Alter and Normal switch position
adjustment, 3-6
amp Id (amplifier current), 10-25
amplifier (IF) adjustment, 3-16
analog bus, 10-20
check of reference frequencies,
7-13
checks, YO coil drive, 7-11
codes, 10-43
correction constants
adjustment, 3-9
nodes, 10-22
analog in menu and keys, 10-21
appendix for source group
troubleshooting, 7-30
assemblies
bottom view, 13-10
part numbers, 13-10
rebuilt-exchange, 13-4
replacement, 5-3, 9-3, 14-3
assembly replacement
A20 disk drive, 14-36
display, 14-12
Index-1
Index
display lamp, 14-12
keypad, 14-10
rear panel, 14-14
attenuation voltage matrix, 9-10
aux input (rear panel auxiliary
input), 10-29
available options, 1-6
B
B1 fan assembly, 14-42
background intensity check for
display, 6-7
backup EEPROM disk, 3-33
band (high/low) transition
adjustment, 3-45
battery, 14-28
block diagram, 4-21
digital control group, 6-3
receiver, 12-28
simplified, 5-4
C
cable inspection, 6-15
cable locations,power supply, 5-9
cable test, 9-6
cables, 13-14, 13-15, 13-16
rear view, 13-16
calibration certificate, 2-3
calibration coefficient terms and
tests, 11-7
card cage boards, 14-24
caution-overload on input error
messages, 8-4
cavity oscillator frequency
correction constants
adjustment, 3-25
CC procedures
ADC offset (test 52), 3-18
analog bus (test 46), 3-9
cavity oscillator frequency (test
54), 3-25
IF amplifier (test 51), 3-16
initialize EEPROM’s (test 58),
3-32
option numbers (test 56), 3-31
retrieve correction constant data
from EEPROM backup disk,
3-34
RF output power (test 47), 3-11
sampler magnitude (test 53),
3-19
source default (test 44), 3-7
source pretune (test 48), 3-10
source pretune default (test 45),
3-8
unprotected hardware option
numbers, 3-52
Index-2
certificate of calibration, 2-3
chassis parts, 13-34, 13-36
check
1st LO signal at sampler/mixer,
8-12
4 MHz REF signal, 8-8
A and B input traces, 8-4
A1/A2 front panel, 6-12
A10 by substitution or signal
examination, 8-9
A11 phase lock, 7-28
A12 digital control signals, 7-18
A13/A14 Fractional-N, 7-20
A13/A14 fractional-N, 7-20
A14 Divide-by-N Circuit Check,
7-23
A14-to-A13 digital control
signals, 7-23
A3 source and A11 phase lock,
7-8
A4 sampler/mixer, 7-8
A7 pulse generator, 7-25
A9 CPU control, 6-5
CPU control, 6-5
disk drive, 4-9
FN LO at A12, 7-16
front panel cables, 6-15
GPIB systems, 4-8
operation of A9 CPU control, 6-5
phase lock error message, 7-6
plotter or printer, 4-8
the 4 kHz signal, 8-11
trace with sampler correction
off, 8-12
YO coil drive with analog bus,
7-11
comb tooth at 3 GHz, 7-26
compression test, 2-58, 2-62
connector care, 1-5
control problems in s-parameters
test sets, 9-10
controller GPIB address, 4-8
controller troubleshooting, 4-9
conventions, formatting, 1-iv
correction constants
ADC offset (test 52), 3-18
analog bus (test 46), 3-9
cavity oscillator frequency (test
54), 3-25
display intensity (test 45), 6-7
IF amplifier (test 51), 3-16
initialize EEPROMs (test 58),
3-32
option numbers (test 56), 3-31
retrieval from EEPROM backup
disk, 3-34
RF output power (test 47), 3-11
sampler magnitude (test 53),
3-19
serial number (test 55), 3-30
source default (test 44), 3-7
source pretune (test 48), 3-10
source pretune default (test 45),
3-8
unprotected hardware option
numbers, 3-52
counter gate, 10-39
covers, 14-6
CPU operation check, 6-5
crosstalk test, 2-32
D
data incorrect, 4-18
default correction constants
adjustment for source, 3-7
adjustment for source pretune,
3-8
detector, 10-26
diagnostic
routines for phase lock, 7-31
tests, 6-16
diagram
A4 sampler/mixer to phase lock
cable, 7-8
digital control group, 6-3
digital control, 4-12
group block diagram, 6-3
lines observed using L INTCOP
as trigger, 8-10
signals A14-to-A13 check, 7-23
signals check, 7-18
signals generated from A14,
7-24
troubleshooting, 6-1
digital data lines observed using L
INTCOP as trigger, 8-10
digital IF, 10-28
directivity (EDF and EDR), 11-9
disk drive
check, 4-9
external, GPIB address, 4-8
replacement, 14-38
display intensity, 6-7
display test, 10-13
displayed spurs with a filter, 3-27
Divide-by-N Circuit Check, 7-23
documentation map, 1-iv
dynamic accuracy test, 2-48
E
ECL reference voltage level, 10-30
edit list menu, 10-7
Index
Index
equipment
cavity oscillator frequency
adjustment, 3-25
display intensity correction
constants adjustment, 6-7
EEPROM backup disk
procedure, 3-33
fractional-N
frequency range adjustment,
3-39
spur avoidance and FM
sideband adjustment, 3-47
frequency accuracy adjustment,
3-42
IF amplifier correction
constants adjustment, 3-16
required, 1-2
RF output power correction
constants adjustment, 3-11
sampler magnitude adjustment,
3-19
source spur avoidance tracking
adjustment, 3-50
error messages, 5-17, 10-44
accessories, 4-19
phase lock loop, 7-6
receiver, 4-18
receiver failure, 8-4
error terms, 9-5, 11-2, 11-3
descriptions, 11-9
directivity (EDF and EDR), 11-9
inspection, 11-8
isolation (crosstalk EXF and
EXR), 11-12
load match (ELF and ELR),
11-13
reflection tracking (ERF and
ERR), 11-11
source match (ESF and ESR),
11-10
transmission tracking (ETF and
ETR), 11-14
external
reference input, 10-37
source mode, 12-24
source mode frequency range
test, 2-14
test sets, 12-26
tests, 10-10
key stuck, 6-13
phase lock error, 7-6
RF power from source, 7-5
fan, 5-19
assembly, 14-42
speeds, 5-19
voltages, 5-19
faulty assembly, 5-11
faulty data, 4-18
firmware revision softkey, 10-41
FM Coil plot with 3 point sweep,
7-29
FN LO at A12 check, 7-16
FN LO waveform at A12J1, 7-16
formatting conventions, 1-iv
FRACN TUNE mode HI OUT
signal, 7-27
fractional-N
check, 7-20
frequency range adjustment,
3-39
sequence, 3-53
spur avoidance and FM
sideband adjustment, 3-47
sequence, 3-53
frequency
accuracy adjustment, 3-42
counter, 10-20
output in SRC tune mode, 7-9
range and accuracy test, 2-4
range of fractional-N
adjustment, 3-39
range, external source, 2-14
response (ratio) test, 2-27
response test, 2-23
front panel
assembly, 13-18, 14-8, 14-10
key codes, 6-13
LEDs, 4-5
troubleshooting, 6-12
F
failure
A1/A2 front panel, 6-12
A11 phase lock and A3 source
check, 7-8
error messages for receiver, 8-4
GPIB, 6-19
H
H MB line, 7-24
hardware, 13-26, 13-28, 13-29,
13-30
bottom view, 13-28
harmonic analysis, 12-23
harmonics test, 2-66, 2-70
Index
G
GPIB
addresses, 4-8
failures, 6-19
service mnemonic definitions,
10-42
system check, 4-8
graphics processor, 14-35
HI OUT signal in FRACN TUNE
mode, 7-27
high band REF signal, 7-15
high quality comb tooth at 3 GHz,
7-26
high stability frequency reference
(option 1D5) assembly, 14-40
high/low band transition
adjustment, 3-45
adjustment sequence, 3-53
how to
adjust
ADC offset correction
constants, 3-18
analog bus correction
constants, 3-9
cavity oscillator frequency
correction constants, 3-25
fractional-N frequency range,
3-39
fractional-N spur avoidance
and FM sideband, 3-47
frequency accuracy, 3-42
high/low band transition, 3-45
IF amplifier correction
constants, 3-16
option numbers correction
constants, 3-31
RF output power correction
constants, 3-11
sampler magnitude correction
constants, 3-19
serial number correction
constants, 3-30
source default correction
constants, 3-7
source pretune correction
constants, 3-10
source pretune default
correction constants, 3-8
source spur avoidance
tracking, 3-50
the analyzer, 3-1
the analyzer using sequences,
3-53
backup the EEPROM disk, 3-33
check display intensity, 6-7
initialize EEPROMs, 3-32
load sequences from disk, 3-53
position the A9 switch, 3-6
retrieve correction constant data
from EEPROM backup disk,
3-34
set up
high/low band transition
adjustments, 3-54
Index-3
Index
the fractional-N frequency
range adjustment, 3-53
the fractional-N spur
avoidance and FM
sideband adjustment, 3-54
troubleshoot
digital control group, 6-1
receiver, 8-1
source group, 7-1
I
IF amplifier correction constants
adjustment, 3-16
IF Det 1, 10-35
IF Det 2N, 10-34
IF Det 2W, 10-34
information,ordering, 13-5
initialize EEPROMs, 3-32
input impedance test, 2-42
input traces A and B check, 8-4
inspect cables, 6-15
instrument markings, 15-4
intermittent problems, 5-20
internal diagnostic
menus, 10-3, 10-4
tests, 6-16
internal tests, 4-13, 10-8, 10-10
invoking tests remotely, 10-42
isolation (crosstalk, EXF and
EXR), 11-12
K
key codes, 6-13
key conventions, 1-iv
key failure identification, 6-13
keypad assemblies, 14-10
keys
how to identify stuck, 6-13
identifying stuck, 6-13
test menu, 10-5
L
L ENREF line, 7-18
L HB and L LB Lines, 7-18
L INTCOP as trigger to observe
control lines, 8-10
L INTCOP as trigger to observe
data lines, 8-10
L LB and L HB Lines, 7-18
L LB and L HB lines, 7-19
LEDs, 4-5, 4-11, 4-12
line fuse, 5-7, 14-5
line fuse,removing, 5-7
line voltage, 5-7
linearity, power, 2-6
LO (2ND) waveforms, 7-17
Index-4
LO OUT waveform at A14J2, 7-22
load match (ELF and ELR), 11-13
lock error, 7-6
log amplifier output detector,
10-28
low band
REF signal, 7-15
subsweep frequencies, 12-18
M
magnitude
compression test, 2-58
dynamic accuracy test, 2-48
frequency response test, 2-23
of sampler adjustment, 3-19
main ADC, 10-20
maintenance, 15-2
major assemblies, 13-8, 13-10
bottom view, 13-10
part numbers, 13-10
rebuilt-exchange, 13-4
measurement
control signals, 9-11
voltage matrix, 9-11
mechanical adjustment
sequences, 3-53
memory deck, 13-32
message for phase lock error, 7-6
minimum R channel level test,
2-12
Mn Pwr DAC (main power DAC),
10-23
motherboard assembly, 14-32
motherboard inspection, 5-12
N
NO IF FOUND
CHECK R INPUT LEVEL, 7-30
NO PHASE LOCK
CHECK R INPUT LEVEL, 7-30
noise floor level test, 2-16, 2-19
Normal and Alter switch position
adjustment, 3-6
number (option) adjustment, 3-31
number (serial) adjustment, 3-30
O
offset (ADC) adjustment, 3-18
open loop compared to phase
locked output in SRC mode,
7-10
operating temperature, 5-12
operation check of A9 CPU, 6-5
operation verification
post-repair, 3-3
operator’s check, 4-6
operator’s check failed, 4-7
option numbers correction
constants adjustment, 3-31
options
002, harmonic mode, 1-6
006, 6 GHz, 1-6
010, time domain, 1-6
1CM, rack mount flange kit
without handles, 1-6
1CP, rack mount flange kit with
handles, 1-6
1D5, high stability frequency
reference, 1-6
available, 1-6
service and support (W01, W31,
W32, W34, W50, W51,
W52), 1-7
service and support (W54), 1-8
ordering information, 13-5
oscilloscope check for reference
frequencies, 7-14
output frequency in SRC tune
mode, 7-9
output voltages, 5-10
overload on input error messages,
8-4
P
panel key codes, 6-13
parts list, 13-7
documentation, 13-37
front panel assembly, 13-20
hardware, 13-31
miscellaneous, 13-37
tools, 13-37
upgrade kits, 13-37
peek/poke menu, 10-40
performance test record, 2-3, 2-73
performance tests, 2-2
external source mode frequency
range, 2-14
harmonic measurement
accuracy, 2-70
post-repair, 3-3
receiver channel noise floor
level, 2-16, 2-19
receiver input crosstalk, 2-32
receiver input impedance, 2-42
receiver magnitude
compression, 2-58
receiver magnitude dynamic
accuracy, 2-48
receiver magnitude frequency
response, 2-23
receiver minimum R channel
level, 2-12
Index
Index
receiver phase compression,
2-62
receiver phase frequency
response (ratio), 2-27
receiver trace noise, 2-38
source and receiver harmonics,
2-66
source frequency range and
accuracy, 2-4
source power range, linearity,
and accuracy, 2-6
peripheral GPIB addresses, 4-8
peripheral troubleshooting, 4-9
phase compression test, 2-62
phase frequency response (ratio)
test, 2-27
phase lock, 10-29
A11 check, 7-28
and A3 source check, 7-8
error, 7-6
error messages, 7-30
reference, 10-37
PHASE LOCK CAL FAILED,
7-30
PHASE LOCK LOST, 7-30
phase locked output compared to
open loop in SRC tune mode,
7-10
plotter and printer check, 4-8
plotter GPIB address, 4-8
PLREF waveforms, 7-15
plug detail,A15, 5-11
post regulator, 5-8
post-repair procedures, 3-3, 14-43
power
accuracy test, 2-6
from source, 7-5
linearity test, 2-6
meter GPIB address, 4-8
problems in S-parameter test
sets, 9-8
range, linearity, and accuracy
test, 2-6
supply, 4-11
block diagram, 5-20
cable locations, 5-9
up LEDs, 4-12
up sequence, 4-12
preregulated voltages
theory of operation, 12-7
preregulator, 13-33, 14-30
preset sequence, 6-13
pretune, 10-31
printer GPIB address, 4-8
probe power voltages, 5-17
procedure
A9 switch positions, 3-6
Index
ADC offset correction constants
(test 52), 3-18
analog bus correction constant
(test 46), 3-9
cavity oscillator correction
constants (test 54), 3-25
EEPROM backup disk, 3-33
fractional-N frequency range
adjustment, 3-39
fractional-N frequency spur
avoidance FM sideband
adjustment, 3-47
frequency accuracy adjustment,
3-42
high/low band transition
adjustment, 3-45
IF amplifier correction
constants (test 51), 3-16
initialize EEPROMs (test 58),
3-32
option numbers correction
constant (test 56), 3-31
retrieve correction constant data
from EEPROM backup disk,
3-34
RF output power correction
constants (test 47), 3-11
sampler magnitude and phase
correction constants (test
53), 3-19
sequences for mechanical
adjustments, 3-53
serial number correction
constant (test 55), 3-30
source
default correction constant
(test 44), 3-7
source pretune correction
constant (test 48), 3-8
source pretune default
correction constant (test
45), 3-8
source spur avoidance tracking
adjustment, 3-50
spur search with a filter, 3-27
spur search without a filter,
3-28
unprotected hardware option
numbers correction
constants, 3-52
pulse generator (A7) check, 7-25
pulses, 100 kHz, 7-14
R
R channel level test, 2-12
range, frequency, 2-4
rear panel
assembly, 13-22, 13-23, 13-24
assembly replacement, 14-14
interface board assembly, 14-16
LEDs, 4-11
rebuilt exchange assemblies, 13-4
receiver
error messages, 4-18
failure error messages, 8-4
test
channel noise floor level, 2-16,
2-19
input crosstalk, 2-32
input impedance, 2-42
magnitude compression, 2-58
magnitude dynamic accuracy,
2-48
magnitude frequency
response, 2-23
minimum R channel level,
2-12
phase compression, 2-62
phase frequency response
(ratio), 2-27
trace noise, 2-38
theory, 12-28
2nd LO signal, 12-29
A10 digital IF, 12-30
A4/A5/A6 sampler/mixer,
12-29
block diagram, 12-28
mixer, 12-30
mixer frequencies, 12-30
troubleshooting, 8-1
REF (4MHz) signal check, 8-8
REF signal At A11TP9, 7-15
reference
4 MHz signal, 7-16
A12 check, 7-12
frequencies check
using analog bus, 7-13
using oscilloscope, 7-14
remote trigger, 9-11
removing line fuse, 5-7
removing power supply, 5-12
replaceable parts, 13-2
battery, 13-10
cables, rear, 13-16
documentation, 13-37
front panel assembly, 13-20
hardware, 13-31
hardware, bottom, 13-28
major assemblies, bottom, 13-10
miscellaneous, 13-37
ordering, 13-5
rebuilt-exchange assemblies,
13-4
tools, 13-37
Index-5
Index
upgrade kits, 13-37
replacement sequence, assembly,
5-3
replacing an assembly, 13-3, 14-3
RF OUT power level, 10-26
RF output power correction
constants adjustment, 3-11
RF power from source, 7-5
S
sampler magnitude correction
constants adjustment, 3-19
search for spurs
with a filter, 3-27
without a filter, 3-28
selector switch, 5-7
self diagnose softkey, 10-7
self-test, 4-5
sequence
fractional-N frequency range
adjustment, 3-53
fractional-N spur avoidance and
FM sideband adjustment,
3-54
high/low band transition
adjustment, 3-54
sequence contents, 3-54
for fractional-N avoidance and
FM sideband adjustment,
3-56
for fractional-N frequency range
adjustment, 3-55
for high/low band transition
adjustment, 3-54
for VCO adjustment, 3-55
serial number correction
constants adjustment, 3-30
service
feature menus, 10-16
key menus and error messages,
10-1, 10-2
key test menu, 10-4
mode menu keys, 10-16, 10-17
options, 1-7, 1-8
setup
cavity oscillator frequency
correction constant routine,
3-26
check, disk drive, 4-9
check, plotter or printer, 4-8
fractional-N spur avoidance and
FM sideband adjustment,
3-47
frequency accuracy adjustment,
3-42
intensity check, 6-8
Index-6
phase lock error
troubleshooting, 7-6
shipment for service, 15-2
shorts and opens, 9-7
signal examination for phase lock,
7-29
signal separation, 12-26
signals required for A10 assembly
operation, 8-9
simplified block diagram, 5-4
Smith chart of shorts and opens,
9-7
softkey, firmware revision, 10-41
source
adjustment
default correction constant,
3-7
pretune correction constants,
3-10
pretune default correction
constants, 3-8
spur avoidance tracking, 3-50
and A11 phase lock check, 7-8
assembly, 14-20
external source mode, 12-24
frequency offset, 12-22
group assemblies, 7-1
group troubleshooting appendix,
7-30
harmonic analysis (option 002),
12-22
high band operation, 12-19
low band operation, 12-17
match (ESF and ESR), 11-10
operation in other
modes/features, 12-22
oscillator tuning voltage, 10-32
output power, 4-14
phase lock error messages, 4-14
power, 7-5
super low band operation, 12-16
test
frequency range and accuracy,
2-4
power range, linearity, and
accuracy, 2-6
source and receiver
harmonics, 2-66
theory overview, 12-14
troubleshooting, 7-1
spikes display (acceptable versus
excessive), 3-51
spur avoidance
and FM sideband adjustment,
3-47
tracking adjustment, 3-50
spur search with a filter, 3-27
Src 1V/GHz (source 1 volt per
GHz), 10-24
SRC tune mode
frequency output, 7-9
phase locked output compared to
open loop, 7-10
waveform integrity, 7-9
stable HI OUT signal in FRACN
TUNE mode, 7-27
stuck keys, identifying using LED
patterns, 6-13
support options, 1-7, 1-8
sweep delay, 9-11
switch position adjustment, 3-6
switch repeatability, 9-4
system verification
post-repair, 3-3
tests, 10-11
T
temperature sensor, 10-26
test
descriptions, 10-8
menu keys, 10-5
options menu, 10-6
patterns, 10-14
record, 2-3, 2-73
status terms, 10-4
test patterns, 10-14
tests (diagnostics), 6-16
theory of operation, 12-1
+5 V digital supply, 12-7
A1 front panel, 12-11
A2 front panel processor, 12-11
A3 source, 12-15
A7 pulse generator, 12-14
A8 post regulator, 12-7
A9 CPU/A10 digital IF, 12-11
A11 phase lock, 12-14
A12 reference, 12-14
A14/A13 Fractional-N, 12-14
A15 preregulator, 12-6
A16 rear panel, 12-13
A17 inverter, 12-13
A18 display, 12-12
A19 GPS, 12-12
digital block diagram, 12-9
digital control, 12-9
digital signal processor, 12-12
display power, 12-8
EEPROM, 12-12
fan circuit and air flow detector,
12-8
function groups, 12-5
line power module, 12-6
main CPU and RAM, 12-11
microprocessor, 12-4
Index
Index
peripheral equipment, 12-4
preregulator voltages, 12-7
probe power, 12-8
receiver block, 12-4
shutdown circuit, 12-8
shutdown indications, 12-7
signal separation, 12-26
source theory overview, 12-14
synthesized source, 12-3
test sets, 12-4
voltage indications, 12-7
tools and equipment, 1-2
trace noise test, 2-38
trace with sampler correction on
and off, 8-12
tracking for source spur avoidance
adjustment, 3-50
transmission tracking (ETF and
ETR), 11-14
troubleshooting, 4-1
1st LO signal at sampler/mixer,
8-12
A1/A2 front panel, 6-12
A7 pulse generator, 7-25
A8, 5-5, 5-8
A10 by substitution or signal
examination, 8-9
A11 phase lock, 7-28
A11 phase lock and A3 source
check, 7-8
A12 reference, 7-12
A13/A14 Fractional-N, 7-20
A14 Divide-by-N Circuit Check,
7-23
A15, 5-7, 5-8
accessories, 9-1, 9-2
control problems in
S-parameters test sets, 9-10
digital control, 6-1
disk drive, 4-9
fan, 5-19
front panel, 6-12
GPIB systems, 4-8
intermittent problems, 5-20
LEDs, 5-5
line fuse, 5-7
one or more inputs look good,
8-11
phase lock error, 7-6
plotters or printers, 4-8
post regulator voltages, 5-6
power problems in S-parameter
test sets, 9-8
power supply, 5-2, 5-5, 5-7, 5-12
receiver, 4-17, 8-1
remote trigger, 9-11
selector switch, 5-7
Index
source, 7-1
source group appendix, 7-30
sweep delay, 9-11
systems with controllers, 4-9
systems with multiple
peripherals, 4-9
test set, 9-8
when all inputs look bad, 8-7
YO coil drive check with analog
bus, 7-11
two port error-correction
procedures, 11-4
type-N connector assembly,
13-30, 14-18
U
unprotected hardware option
numbers correction
constants, 3-52
V
V reference, 10-29
VCO
A14 exercise, 7-22
detector, 10-39
range check frequencies, 7-20
tune voltage, 10-36
VCXO tuning voltage, 10-38
verification procedure
post-repair, 3-3
verification test, 10-11
verify A15 preregulator, 5-10
voltages
YO- and YO+ coil drive voltage
differences with & SOURCE
PLL OFF, 7-12
W
W01, option, 1-7
W31, option, 1-7
W32, option, 1-7
W34, option, 1-7
W50, option, 1-7
W51, option, 1-7
W52, option, 1-7
W54, option, 1-8
waveform integrity in SRC tune
mode, 7-9
Y
YO- and YO+ coil drive voltage
differences with & SOURCE
PLL OFF, 7-12
YO coil drive check with analog
bus, 7-11
Index-7