SoC Test System - Chroma ATE Inc.

SoC Test System
MODEL 3650-CX
Chroma 3650-CX brings you the low cost and high performance test solution
3650-CX adopts the all-in-one design to provide a compact size ATE with very low cost,
high accuracy and high throughput for customers to save the cost and raise the profit.
With the versatile test capabilities and powerful software tools, 3650-CX is designed for
MCU, NAND flash controllers, the peripheral devices of PC, switch devices, LED driver ICs,
power ICs and consumer SoC devices.
CRISP, the powerful system software for 3650-CX
The 3650-CX features powerful suite of software
tools using Chroma Integrated Software Platform,
CRISP. It not only provides the rapid test developing
functions, CRISP also covers all needs for test
debugging, production and data analysis. Base
on the Microsoft Windows XP ® operation system
and C++ programming language, CRISP provides
powerful, easy-to-use, intuitive and fast-runtime
GUI tools for users. The CRISP includes test plan
debugger, pattern editor, waveform tool, scope tool,
pin margin, Shmoo, wafer map, histogram, STDF
tool, datalog and etc.
All-in-one design and compact size to save the floor space
With the air-cooled and zero footprint tester-in-a-test-head design, 3650-CX delivers high
throughput in a highly integrated package for minimum floor space. With an optional
manipulator, 3650-CX can be used in both package and wafer sort test.
Peripheral
The 3650-CX provides multiple drivers for communications with handler and prober
by GPIB and TTL interface. The supported handlers or probers include SEIKO-EPSON,
SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK and OPUS II, and so forth.
Key Features
■ 50 / 100 MHz; 200 Mhz (MUX) Clock Rate
■ 50 / 100 Mbps; 200 Mbps (MUX) Data Rate
■ Up to 256 digital I/O pins
■ 16/32 (option) MW vector memory
■ 16/32 (option) MW pattern instruction
memory
■ Per-pin timing/PPMU/frequency
measurement
■ Up to 4-16 16-bit ADDA channels option
■ SW configurable scan chains in 1024M
depth or up to 32 scan chains/board
■ ALPG option for memory test
■ Up to 16 high-voltage pins
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■
■
■
■
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16 high-performance DPS channels
Overall timing accuracy < ±550ps
8 ~ 32-CH / board for VI45 analog option
2 ~ 8-CH / board for PVI100 analog option
Microsoft Windows® XP OS
C++ and GUI programming interface
CRISP, full suite of intuitive software tools
Air-cooled, All-in-one design and
space-saving footprint
■ Cable mount / Direct mount
Versatile
Compact Size
IC Tester for
Digital,
Mixed Signal and
Analog ICs
Applications
■ MCU/MCU + Embedded Memory
■ NAND Flash Controller
■ PC I/O
■ Switch ICs
■ Smart Power Management Devices
■ Mixed Signal, Digital and Analog ICs
STB
■
■
■
■
■
ADC/DAC/CODEC ICs
Consumer ICs
Engineering, Wafer Sort and Final Test
Power ICs
LED Driver ICs
LED Driver ICs
Power ICs
PC I/O
SoC
Chroma 3650-CX
TCON/
LCD Controller
High Performance
MCU
Consumer IC
SPECIFICATIONS
Model 3650-CX
Clock Rate
Data Rate
Pattern Memory Size
Overall Timing Accuracy
Software /Programming Language / OS
50 / 100 Mhz; 200 Mhz (MUX mode)
50 / 100 Mbps; 200 Mbps (MUX mode)
16 / 32M (Option)
±550ps (Window), ±450ps (Edge)
CRISP/ C++ / Windows XP
IO Channels
Vector Depth
Drive VIL / VIH
Maximum Driver Current
Comparator VOL / VOH
Compare Modes
EPA (Drive / IO / Compare)
Dynamic Load Current
Timing Sets
Timing Edges
Rate / Edge Resolution
Waveform Sets
Waveform Format
Utility Pin Relay Control
PPMU/Frequency Measurement Unit (OSC)
DUT Power Supply
Channels
Voltage Range
Maximum Output Current
Current Gang Channels
Precision Measurement Unit
Channels
Voltage Range
Current Range
Options
ADDA/HDADDA
Channels
AWG / Digitizer
Resolution / Max. Conversion Rate
Voltage Range
Algorithm Pattern Generator (ALPG)
Scan
VI45
Channels
Voltage / Current Range
Current Ganged Channels
TMU
PVI100
Channels
Voltage / Current Range
Current Ganged Channels
TMU
System and Dimension
Power Consumption
Cooling System
Frame Size
Weight
64-pin / Board X 4 Boards / System
16 / 32M per pin
-2 ~ +6V / -1.9 ~ +7V [ -1.5 ~ +6.4V/-1.4 ~ +6.5V ]
50mA (static) / 100mA (dynamic)
-2 ~ +7V [ -1.5 ~ +6.5V ]
Edge, Window
±300ps / ±300ps / ±300ps
±35mA [ ±25mA ]
32 sets per pin
6 (2 Drive, 2 Drive & IO, 2 Compare)
125 / 62.5ps
32 sets per pin
4096 Timing-Waveform Combination Changes on-the-fly
64 (8 / Board), 128 bit relay board option available
per pin
Pin Electronics Board
LPC [LPC2]
DPS
16-CH / Board X 1 Boards / System
±8V, ±16V
0.8A / 1-CH
x2 ~ x8
PMU
2-CH / Board X 4 Boards / System
±2.5V, ±8V, ±16V
±800nA ~ ±250mA
1 ADDA CH / LPC or 16 CH HDADDA / board
per channel
ADDA: 16-bit / 500KHz ; HDADDA: 16 Bit 500 KHz
±2.5V / ±4.5V / ±9V
X = 16, Y = 16 / D = 16
1 / 2 / 4 / 8 / 16 / 32 scan chains, Max 1024M depth
8 ~ 32-CH / Board
±45V / ±100mA
4 buses for 8 channels, x2 – x8, 800mA max
per channel
2 ~ 8-CH / Board
±100V / ±2A , ±50V / ±4A
x2 – x8, 32A max
per channel
3.5KW Max
Forced Air Cooling
L 643 x W 369 x H 760 mm
130Kg
ORDERING INFORMATION
3650-CX : SoC Test System
Worldwide Distribution and
Service Network
Developed and Manufactured by :
CHROMA ATE INC.
致茂電子股份有限公司
HEADQUARTERS
66 Hwaya 1st Rd., Kueishan
Hwaya Technology Park,
Taoyuan County 33383,
Taiwan
Tel: +886-3-327-9999
Fax: +886-3-327-8898
http://www.chromaate.com
E-mail:info@chromaate.com
CHINA
CHROMA ELECTRONICS
(SHENZHEN) CO., LTD.
8F, No.4, Nanyou Tian An
Industrial Estate, Shenzhen,
China PC: 518052
Tel: +86-755-2664-4598
Fax: +86-755-2641-9620
CHROMA ELECTRONICS
(SHANGHAI) CO., LTD.
3F Building 40, No. 333, Qin
Jiang Rd.,Shanghai, China
Tel: +86-21-6495-9900
Fax: +86-21-6495-3964
JAPAN
CHROMA JAPAN CORP.
472 Nippa-cho,Kouhoku-ku,
Yokohama-shi, Kanagawa,
223-0057 Japan
Tel: +81-045-542-1118
Fax: +81-045-542-1080
http://www.chroma.co.jp
U.S.A.
CHROMA ATE INC. (U.S.A.)
7 Chrysler Irvine, CA 92618
Tel: +1-949-421-0355
Fax: +1-949-421-0353
Toll Free: +1-800-478-2026
http://www.chromaus.com
E-mail: info@chromaus.com
EUROPE
CHROMA ATE EUROPE B.V.
Morsestraat 32, 6716 AH Ede,
The Netherlands
Tel: +31-318-648282
Fax: +31-318-648288
http://www.chromaeu.com
E-mail: sales@chromaeu.com
3650CX-E-201306-500
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