Inverted Metallurgical Microscopes

Inverted Metallurgical Microscopes ECLIPSE MA200/MA100
Inverted Metallurgical Microscopes
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Model features
Nikon offers 3 models of inverted metallurgical microscopes.
The MA200 is designed for all the observation methods,
The MA100/MA100L are designed for basic observation
Thanks to its unique, solid-box structure, the MA200 offers high
stability, durability, and a smaller footprint than conventional
models as well as easy access to the stage handle, the
nosepiece, BF/DF change lever, and diaphragms located at
front side.
Compatible
observation methods
Brightfield
Simple
polarizing
Darkfield
DIC
Fluorescence
*DIA illuminator is available for transmitted light observation.
Compatible
illminators
Magnification module
Compatible stages
LV-LH50PC 12V50W Halogen Lamp Illuminator
C-HGFI HG Precentered Fiber Illuminator (*option)
bright field, dark field, simple polarizing, differential interference,and fluorescence observations.
methods, bright field and simple polarizing observations.
The MA100/MA100L are compact, inverted microscopes designed for bright field and simple polarizing
observations. Its small foot-print, rigid construction of its stage, easy operation, and superior Nikon optics,
make it an ideal bench-top solution for: daily quality control of heat-treated metals, plastics, thin films,
contaminants, chemicals, strain-tested materials, glasses, etc.
MA100 with halogen light source and LED light source are available.
Brightfield
Darkfield
Simple
polarizing
DIC
Fluorescence
*Dedicated reflected illumination models.
6V30W Halogen Lamp Illuminator
(internal power supply)
1W white LED Illuminator
(internal power supply)
1x/1.5x/2x
MA2-SR Mechanical Stage (stroke: 50 x 50 mm)
MA-SR Rectangular 3-plate Stage (stroke: 50 x 50 mm)
MA-SP Plain Stage
TI-SM Attachable Mechanical Stage CH (stroke: 126 x 80 mm)
*Please use in combination with MA-SP plane stage.
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Integration with digital camera for microscopy "Digigtal Sight series"
The MA200 allows detection of information and control of objective lenses via the camera control unit, enabling optimization of
the conditions vital for image acquisition.
New solution from Nikon:
An ideal new microscope
DS camera heads
Detection of
objective lens information
Automatic calibration
conversion
All controls are on the front of the instrument.
Delivers ease-of-use by placing all important
controls on the front.
Super-wide field of view
The ultra wide field of view eyepiece
and with the combination of the
newly developed 1x objective lens,
a sample of 25mm diameter can be
observed in an one field of view.
2
3
4
10
6
1
2
3
4
5
7
Optical path changeover lever
(vertical tube/binocular tube)
Nosepiece
Aperture diaphragm dial
Field diaphragm dial
Brightness control dial
Conventional model’s field
T Plan EPI 1x
6
7
8
9
10
Operation port for the
polarizer/analyzer unit and
the fluorescent unit
Display
BD field changeover lever
Scale slider slot
Flexible handle stage
Quick Status Check
The observation position of the objective lens and sample
can be checked easily from the microscope’s front panel.
Semi-Apochromat
Wide field of view
Stage
Holders
The holder comes with a stage clip that enable sample
rotation. This flexible handle stage
delivers high durability needed to
support heavy samples.
We offer a full lineup of holders
that correspond to a variety of
sample shapes.
1 MA-2 SR Stage
Even Illumination
Polarizing
1
Combine up to eight
images with the stitching
feature. Get natural looking
images with uniform
lighting and no seams.
DIC
You can choose standard or high
contrast type DIC prism for best
match to the sample.
It is effective for observation of
minute step heights.
1
Single-action operation
Links the attachment/release
of the analyzer/polarizer.
2
2
1
Polarizing observation is effective
for birefringence samples.
MA2-PA unit is suitable for
observation of aluminium.
Improved uniformity of illumination delivers clear images,
especially for digital imaging.
Combine up to eight images with the stitching feature
Automatically detects the address of
the objective lens currently in use and
displays it on the main unit front panel.
PC control-based
control unit
DS-U3 (+NIS-Elements)
ø13.3 mm
MA200's field
9
*1: Control of the nosepiece from the camera
control unit is available in combination with
the Motorized Nosepiece and the LV-NCNT-2
Motorized Nosepiece Controller.
ø25mm
8
5
Control of objective lens*1
Basic performance dramatically improved. Provides
a more ergonomic and clear image observation.
1
Stand alone
control unit DS-L3
3
Aluminium sample
Brightfield
Polarizing
1 MA2-PA Unit
2 MA2-UPA Unit*
3 MA2- P Plate
3
*It is suitable for inspecting
aluminium sample.
1 MA2-PA Unit
2 L-DIHC DIC Prism (High Contrast)
3 L-DIC DIC Prism
600
Smaller footprint than conventional models:
Three times free spaces left! Improved durability
thanks to the unique box structure.
Nosepiece & Magnification Module
341
Enables communication of objective lens position,
magnification and intermediate magnification module
information with the DS-L3 control unit and NIS-Elements
image software.
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1 MA2-MC Magnification Module
2 MA2-NUI5 Universal
Intelligent Quintuple
1
Overlays a pattern onto the observed image. MA2-GR
Grain Size Reticle is used for grain size analysis which is
compliant to JIS G0551 and ASTM E112 standards.
The MA2-MR Scale is used for scale display for each
objective magnification.
1 MA2-GR Grain Size Reticle
JIS G0551/objective lense 10x
(100x magnification)
ASTM E112/objective lense 10x
(100x magnification)
2 MA2-MR Scale
2
Nosepiece
High stability/durability
Vibration during high-power observation is reduced.
Extremely high rigidity.
315
597
Compact structure with a depth of 315 mm
A box shaped microscope, not only the width but also the
depth is reduced dramatically: The foot print is only onethird of the conventional model!
Grain Size Reticle & Scale
TME300
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(Conventional model)
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Introducing a durable, user-friendly Inverted Microscope with,
superior image quality, a small footprint, and great cost performance
The ECLIPSE MA100 is a compact inverted microscope specially designed to meet the needs of reflected
foot-print, durable construction, simple operation, and superior Nikon optics, make it an ideal benchquality control/quality assurance applications.
MA100L with LED light source
The MA100/MA100L with LED light source is a newl option.
The bright LED light source features low power
consumption and long life resulting in operating cost
savings. A change in the intensity of the LED has less
influence on color temperature than that of halogen lamp.
Halogen illuminator
The conventional
MA100 with 6V30W
halogen lamp is
maintainedgfor users
wanting the spectrum
of a halogen lamp for
natural color.
light observations requiring either brightfield or simple polarization illumination techniques. Its small
top solution for: metallurgical samples, electronic components, failure analysis, materials science and
Stable control even with heavy samples
A newly developed stage boasting
superior durability
Stage+Holders A
A simple fixed stage.
1
2
3
4
MA-SP Plain Stage
Acrylic Sample Holder (standard accessory / ø30mm aperture)
MA-SH3 Specimen Holder 3
3
MA-SRSH1 Universal
1
Specimen Holder
4
5 Acrylic Sample Holder
2
Nikon developed the new MA-SR Rectangular Stage
especially for the MA100. The three-plate structure gives
the microscope
superior control
and durability for
observation of heavy
samples, such as a
grinder resin mounted
samples.
(standard accessory/
crescent aperture)
5
Stage+Holders B
A dual-platform stage.
1
2
3
4
LED illuminator (MA100L)
Sharp, clear images using CFI60-2 optics
Aperture diaphragm comes standard
Nikon's CFI60 optical system,
highly evaluated for its unique
concept of high NA combined
with long working distance has
further evolved to achieve the
apex in long working distance
and chromatic aberration
correction.
The epi illuminator
comes standard with
a variable aperture
diaphragm to control
image contrast and
depth of field.
TI-SM Mechanical Stage CH
C-HU Universal Holder
MA-SH1 Specimen Holder 1
MA-SH2 Specimen Holder 2
1
2
*Please use in combination with
MA-SP plane stage.
3
Stage+Holders C
Grain Size Reticle
The class of grain size in a sample
can be easily distinguished while
observing its image.
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1
A triple-platform stage structure lets you use heavy samples.
1 MA-SR Rectangular Stage
2 Specimen Holder (standard
accessory / ø20mm aperture)
3 MA-SH3 Specimen Holder 3
4 MA-SRSH1 Universal
1 MA100-EPRGS Grain Size Reticle
1
3
4
2
Specimen Holder
5
5 Specimen Holder (standard
accessory / ø40mm aperture)
6
Simple polarization with a single-action polarizer/analyzer mechanism
Simple Polarizing
MA2-PA Unit contains a polarizer and an analyzer for polarized light observation. The
polarizer and analyzer can be shuttled in and out along the optical path by one single
action. The polarizer can also rotate 360° to allows it to set the direction of polarization
most suitable for a sample observed.
An accessory necessary for simple
polarization observation.
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1 MA-P/A Simple Polarizer
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Accessory
Stand alone
control unit
Nikon's CFI60 optical system, highly evaluated for its unique concept of high NA combined
with long working distance has further evolved to achieve the apex in long working distance
and chromatic aberration correction.
Standard objective lenses
TU Plan Fluor Series
EPI/BD
5x/10x/20x/50x/100x
Long
WD
Semiapo
Light
weight
Fly-eye
lens
These universal type standard objective
lenses enable brightfield, darkfield, simple
polarizing, sensitive polarizing, differential interference, and
epi-fluorescence observation in one lens.
Low-magnification objective lenses
T Plan EPI
EPI
Model
TU Plan Fluor EPI
(brightfield type)
Magnification
NA
Working Distance (mm)
5×
10×
20×
0.15
0.30
23.5
17.5
0.45
0.80
4.5
1.0
0.90
0.15
0.30
0.45
0.80
0.90
1.0
18.0
15.0
4.5
1.0
1.0
50×
100×
TU Plan Fluor BD
(brightfield/ darkfield type)
5×
10×
20×
50×
100×
Long working distance objective lenses
TU Plan ELWD Series
EPI/BD
Long
WD
20x/50x/100x
(brightfield type)
TU Plan BD ELWD
(brightfield/ darkfield type)
3.8
6.5
Long
WD
Light
weight
Apo
50x/100x/150x
Model
TU Plan Apo EPI
(brightfield type)
Scene mode
Measurement function
Wafer/IC
Metal, Ceramic/Plastic
Circuit board
Flat Panel Display
Position and size comparison functions
NA
Working Distance (mm)
20×
0.4
19.0
50×
100×
20×
50×
0.6
0.8
0.4
11.0
4.5
19.0
0.6
11.0
100×
0.8
4.5
Drawing functions
PC control-based
control unit
From display and shooting of live images to advanced image processing
and analysis, the DS-U3 allows the control of all functions from a PC
and is flexibly adaptable to a wide range of applications.
NIS-Elements
Comprehensive imaging software series
* Depicted is the brightfield
observation (EPI) objective lens.
NA
Working Distance (mm)
50×
0.8
0.9
2.0
2.0
0.9
1.5
50×
0.8
2.0
100×
150×
0.9
0.9
2.0
1.5
NIS-Elements series as control software. NIS-Elements allows functions from basic
imaging to control of the microscope and peripheral devices to be performed, as well
as the measurement, analysis, and management of acquired images.
Large image
Manual measurement and image annotation
Stitches together images from multiple fields of view during
shooting to create an image with wide field of view. Images
already acquired can also be stitched together.
Manual Measurement allows easy measurement of length and area
by drawing lines or an object directly on the image. The results can
be attached to the image, and also exported as text or to an Excel
spreadsheet.
Cast iron analysis
Grain size analysis
Magnification
Measurement (2 point distance)
Using NIS-Elements imaging software, you can perform image acquisition, processing, and analysis.
Magnification
100×
150×
A wide variety of tools
The DS-L3 enables the conducting
of simple measurements on images,
with input of lines and comments.
These can also be written onto
and saved with the image, and
measurement data can be output.
Adaptable to a wide range of applications
* Scheduled for sale from January 2013.
TU Plan Apo BD
(brightfield/ darkfield type)
* Depicted is the brightfield observation (EPI) objective lens.
Model
TU Plan EPI ELWD
Working Distance (mm)
0.03
0.075
By using phase Fresnel
lenses, these objective lenses
achieve significantly longer
operating distances while
maintaining the superior
chromatic aberration
performance of apochromatic
lenses. A 50x lens is new to
the line-up.
Light
weight
Through the use of phase Fresnel lenses, these
objective lenses enable long working distances
while offering higher-level
chromatic aberration
correction than
conventional objective
lenses. This further
improves operability for
samples with differences
in level.
NA
1×
2.5×
TU Plan Apo Series
High-definition touch panel monitor
Built-in 8.4" 1024 x 768 monitor. Easy to see and easy to use, the
large touch-panel monitor allows simple setting and operation of
the camera head with a touch of a finger or stylus.
Optimal imaging parameters for each
sample type and observation method
can easily be set through the icons.
Magnification
Apochromatic objective lenses
EPI/BD
Semiapo
Wide
field of
view
These low-magnification objective
lenses enable clear observation using
a conventional analyzer/polarizer, as
well as operability-oriented observation
without need for an analyzer/polarizer.
Model
T Plan EPI
(brightfield type)
* Depicted is the brightfield observation (EPI) objective lens.
Semiapo
1x/2.5x
Equipped with a large touch panel monitor and a rich feature set, the DS-L3's ease of
operation enables quick image acquisition even without a PC or computer monitor.
Other Lens
Brightfield objective lense
Detects and measures grains in one and two phase samples
according to JIS G0551 or ASTM E112-96/E1382-97 standards.
Detects, measures and classifies graphite content as well as
ferrite content in graphite-corrected samples according to JIS
G5502 or ASTM A247-06 standards.
CFI L Plan EPI 40x
A 40x objective lens is best for
metal analysis.
NA: 0.65 W.D.: 1.0mm
* See the "Digital Camera Digital Sight Series for Microscopes" catalog for details on Digital Sight features.
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System Diagram (MA200)
System Diagram (MA100/MA100L)
C-mount
Zoom
Adapter
C-mount
Adapter
0.35x
0.45x
0.6x
0.7x
C-mount
Adapter
TV Zoom
Lens
Filter
45mm
MA-SH1
Specimen Holder 1
Filter 45mm GFI
Filter 45mm NCB11
MA-SRSH1 Universal
Specimen Holder
ø36
(ø39)
for 1 1/2”
ø30
for 30mm
ø40
for 40mm
MA2-SRSH Specimen Holder Set (with clip, mm)
Filter 45mm ND16 A
C-mount
Adapter
VM4x
C-mount
Adapter
VM2.5x
12V100W
Lamp
T-P2
DIC Polarizer
MA-SH2
Specimen Holder 2
D-LH/LC
Lamphouse W/LC
C-mount
Adapter
0.55x
LV-TV
TV Adapter
C-TB
Binocular Tube
C-HU
Universal Holder
CFI
CFI
CFI
CFI
10xM 10xCM 12.5x 15x
C-CT
Centering
Telescope
DS-L3
TI-C
Condenser
Turret
Measurement
Telescope
10xN
CFI
UW
10xM
CFI
UW
10x
TI-C-LWD
LWD Lens
Adapter
A
C
T Plan EPI
Objective Lens*1
TE-C
ELWD-S
Condenser
TU Plan Fluor EPI
Objective Lens
MA2-MP2
Monitor Pillar 2
(Interface cable
included)
6V30W
Halogen Lamp
100V/120V
230V
C-W15x
B
A
MA2-UPA Unit
(Polarizer + Analyzer +
1/4 Plate)
C-LHGFI
HG Lamp
C
MA2-MC
Magnification Module
MA-P/A
Simple Polarizing Set
LV-LH50PC
12V50W
Lamphouse
B
C
MA100-EPRGS
Grain Size Reticle
A
C
T Plan EPI SLWD
Objective Lens
LV-HL50W
12V-50W-LL Lamp
C-W10xA
A
TU Plan Apo EPI
Objective Lens
MC TMD2
ELWD Lens
C-Mount
Adapter 0.7x
C
E
C-ER
Eyelevel Riser
DS AC Adapter 2
B
TU Plan EPI ELWD
Objective Lens
F
MA2-FL Unit
(G,B,BV,V Excitation)
DS series
camera
head
C-Mount
TV Adapter A
MA2-TI3
Trinocular
Tube TI3
MA-TT2
Tilting Trinocular Tube*1
(Includes two
specimen holders)
B
E
F
E
F
(Includes two holders
for acrylic samples)
DS Camera
Control Unit
DS-L3
DS Camera
I/F Cable 20-26
MA-SR
Rectangular Stage
MA-SP Plain Stage
TI-PS 100W
PS100-240
MA2-DP
100W Pillar
MA2-PA Unit
(Polarizer + Analyzer)
ø25
for 25mm
MA-SH3
Specimen Holder 3
Filter 45mm ND2 A
V-T Photo
Adapter
LV-10x CFI
10x
ESD
ø30
(ø33)
for 1 1/4”
MA2-SRSH Specimen Holder Set (with clip)
C-mount
Adapter
0.7x
C-mount
TV Adapter A
Relay
Lens
1x
F
ø23
(ø26)
for 1”
TI-SM
Mechanical Stage CH
C-mount CCD Camera
D
*1: T Plan EPI 1x/2.5x enable clear observation using a
conventional analyzer/polarizer, as well as operability-oriented
observation without need for an analyzer/polarizer.
C-HGFIF
HG Fiber (1.5m/3m)
LV-HGFA
HG Fiber
Adapter
MA2-GR Grain Size
C-HGFI
Fiber Light Sourse
(Manual)
D
MA2-MR Scale
C-HGFIE
Fiber Light Sourse
(Motorized)
ø36 (ø39)
for 1 1/2”
230
202
107
V
W
A
W
W
L-DIC
DIC Prism
118
210
210
90
226
228
210
90
90
124
118
170
228
228
118
57
341
15.5
315
124
188
400
LV-NU5A
Universal
Motorized
Quintuple
Nosepeice
318
MA2-NUI5
Universal
Intelligent
Quintupule
Nosepeice
167
U
D-NI7
Intelligent
Septuple
Nosepiece
400
S
614
664
L-DIHC
DIC Prism
High Contrast
ø57
Plate
B
205
D-DA
DIC Analyzer
D-NID6
Intelligent
Sextuple
DIC Nosepiece
50
50
75
D-LP
TU Plan
BD ELWD
Objective
Lens
318
LV-DIHC Slider
(High Contrast)
Position A&B
V
TU Plan
Apo BD
Objective
Lens
LU Nosepiece
Adapter
M32-25
LV-DIC Slider
Position A&B
U
TU Plan
Fluor BD
Objective
Lens
T Plan
EPI SLWD
Objective
Lens
174
230
309
TU Plan
EPI ELWD
Objective
Lens
120
TU Plan
Apo EPI
Objective
Lens
308
TU Plan
Fluor EPI
Objective
Lens
118
MA2-SR
Stage
MA-SRSH
25-40 Holder
210
MA-SRSH1
Holder
118
MA-SRSH 10
Holder
521
MA-SRSH 40
Holder
167
ø40
for 40mm
MA2-SRSH Specimen Holder Set (with clip, mm)
T Plan EPI
Objective
Lens*2
S
ø30
for 30mm
3-M5
228
ø25
for 25mm
Standard
Holder 22
(Comes standard)
493
174
118
MA2-SRSH Specimen Holder Set (with clip)
226
ø30 (ø33)
for 1 1/4”
124
ø23 (ø26)
for 1”
Dimensions
170
Plate
205
123
MA2- P
45
110
231
110
231
LV-NCNT2
Nosepiece
Controller
*1: Built to order.
*2: T Plan EPI 1x/2.5x enable clear observation using a conventional analyzer/polarizer,
as well as operability-oriented observation without need for an analyzer/polarizer.
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Specifications (MA200)
Main body
Optics
Observation image
Observation method
Revolving nosepieces
Stage
Trinocular eyepiece
Power input
Electric power consumption
Weight
Option
Focusing mechanism Focusing nosepiece (Fixed stage) Coaxial coarse/fine adjustment knob (torque adjustable)
Coarse adjustment of 4.0 mm per rotation, fine adjustment of 0.2 mm per rotation
Illumination
With flare prevention, Built in UV cut filter
Field diaphragm: dialing continuous variable (centerable), Aperture diaphragm: dialing continuous variable (centerable)
Filter: Double turret (ND16, ND4/GIF, NCB, Additional option available), Polarizing block (Selectable with or without 1/4 Plate)
Fluorescence filter blocks: B/G/V/BV, Built in 12V50W halogen lamp, C-HGFI HG Fiber Illuminator
Light distribution
Eyepiece tube/Back port: 100/0, 55/45
CFI 60 /CFI 60 -2 system
Surface Image
Bright/Darkfield/Simple Polarizing/DIC/Epi-Fluorescence
MA2-NUI5: Bright/Darkfield/DIC 5 position nosepiece, LV-NU5A: Motorized Bright/Darkfield/DIC 5 position nosepiece
D-NID6: Bright/Darkfield 6 position nosepiece (Intelligent), D-NI7: Brightfield 7 position nosepiece (Intelligent)
MA2-SR Mechanical Stage (X/Y flexible handle)
Dimension: 295 x 215mm, Stroke: 50mm x 50mm (with distance graduation), Standard accessory: ø22 universal specimen holder (with sample clip)
Seidentopf, interpupillary distance adjustment 50-75mm
100-240V, 50-60Hz
1.2A 75W
Approx. 26 kg (depends on combination)
Intermediate magnification Turret (1x, 1.5x, 2x), Status detection (Output magnification information to main unit)
Scale
MA2-GR Grain Reticle (ASTM E112-63 grain sizing numbers 1 to 8), Grid Reticle(20 lines, 0.5mm)
MA2-MR Scale Reticle (compatible with 5-100x, Read in um, Dialing System)
Specifications (MA100/MA100L)
Optics
Observation image
Observation method
Focusing
CFI 60 /CFI 60 -2 system
Reversed image
Brightfield and polarization (with MA P/A simple polarizer/analyzer set)
Focusing nosepiece (fixed stage), coaxial coarse/fine adjustment knob with 8.5-mm stroke
(Coarse adjustment of 37.7mm per turn, fine adjustment of 0.2mm per turn)
Nosepiece
Brightfield 5-position nosepiece
Stage
MA-SR Rectangular 3-plate Stage 50 x 50 mm stroke (includes two stage inserts (ø20mm and 40mm opening) and coaxial control handle on the right side
The 3-plate design allows entire top surface to move. Optional Stage inserts: MA-SRSH1 Specimen Holder 1 with (ø15mm opening or MA-SH3
Specimen Holder 3 with 2mm to 32mm adjustable opening
MA-SP Plain Stage 170 x 230mm - Includes two stage inserts (1) clear acrylic stage insert with ø30mm opening, (2) clear acrylic stage insert with
crescent opening (width 30mm) to allow clearance for rotation of high magnification objectives
Optional stage inserts: MA-SRSH1 Specimen Holder 1 with 15mm opening or MA-SH3 Specimen Holder 3 with 2mm to 32mm adjustable opening
Accepts Attachable Mechanical Stage TI-SM
TI-SM Attachable Mechanical Stage CH 126mm x 80mm stroke, handle can be attached on the right or left side of the plain stage
Optional Specimen Holders to fit Attachable Mechanical stage: MA-SH1 Specimen Holder 1 (ø15mm opening)
MA-SH2 Specimen Holder 2 ( ø30mm opening), or C-HU Universal Holder (30mm to 65mm adjustable opening)
Illuminator
Internal power supply 6V30W Halogen Lamp (long-life type)
Internal power supply 1W white LED light source
Condenser built-in (lever operated)
Condenser built-in (lever operated)
ø25mm filter (includes NCB11 and ND4) can be inserted
Binocular body
Built-in Siedentopf binocular, 45 inclination angle and 50 to 75-mm interpupillary adjustment
Power consumption (max.) 42 W (nominal value)
3 W (nominal value)
External dimensions 230 x 664 x 381 mm (W x D x H)
230 x 614 x 381 mm (W x D x H)
Weight
8.4kg
7.2 kg
Specifications and equipment are subject to change without any notice or obligation on the part of the manufacturer. Decenber 2012 ©2006/2007/2008/2009/2011/2012 NIKON CORPORATION
N.B. Export of the products* in this catarog is controlled under the Japanese Foreign Exchange and Foreign Trade Law. Appropriate export procedures shall be required in case of export from Japan.
*Products: Hardware and its technical information (including software)
NIKON CORPORATION
Shin-Yurakucho Bldg., 12-1, Yurakucho 1-chome
Chiyoda-ku, Tokyo 100-8331 Japan
phone: +81-3-3216-2384 fax: +81-3-3216-2388
http://www.nikon.com/instruments/
NIKON METROLOGY, INC.
12701 Grand River Avenue, Brighton, MI 48116 U.S.A.
phone: +1-810-220-4360 fax: +1-810-220-4300
E-mail: sales_us@nikonmetrology.com
http://www.nikonmetrology.com/
NIKON METROLOGY EUROPE NV
Geldenaaksebaan 329, 3001 Leuven, Belgium
phone: +32-16-74-01-00 fax: +32-16-74-01-03
NIKON SINGAPORE PTE LTD.
NIKON METROLOGY UK LTD.
NIKON MALAYSIA SDN. BHD.
E-mail: sales_uk@nikonmetrology.com
NIKON INSTRUMENTS KOREA CO., LTD.
FRANCE phone: +33-1-60-86-09-76 fax: +33-1-60-86-57-35
SINGAPORE phone: +65-6559-3618 fax: +65-6559-3668
MALAYSIA phone: +60-3-7809-3688 fax: +60-3-7809-3633
KOREA phone: +82-2-2186-8400 fax: +82-2-555-4415
NIKON INDIA PRIVATE LIMITED
Email: sales_europe@nikonmetrology.com
http://www.nikonmetrology.com/
INDIA phone: +91-124-4688500 fax: +91-124-4688527
NIKON INSTRUMENTS (SHANGHAI) CO., LTD.
CANADA phone: +1-905-602-9676 fax: +1-905-602-9953
CHINA phone: +86-21-6841-2050 fax: +86-21-6841-2060
(Beijing branch) phone: +86-10-5831-2028 fax: +86-10-5831-2026
(Guangzhou branch) phone: +86-20-3882-0550 fax: +86-20-3882-0580
Printed in Japan (1206-05) Am/M
NIKON CANADA INC.
NIKON INSTRUMENTS S.p.A.
ITALY phone: +39-055-300-96-01 fax: +39-055-30-09-93
Code No. 2CE-KGSH-4
www.microscope.ru
UNITED KINGDOM phone: +44-1332-811-349 fax: +44-1332-639-881
NIKON METROLOGY SARL
E-mail: sales_france@nikonmetrology.com
NIKON METROLOGY GMBH
GERMANY phone: +49-6023-91733-0 fax: +49-6023-91733-229
E-mail: sales_germany@nikonmetrology.com
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