B3818-1.0 en GEN series GN610 Isolated 1 kV 2 MS/s Input Card

Isolated 1 kV 2 MS/s
Input Card
Features and Benefits
-
Basic 1 kV ISO 2 MS/s Input Card
The GEN DAQ series Isolated 1 kV 2 MS/s
Input Card has a general purpose signal
conditioner for use with especially high voltage
inputs and externally conditioned signals. The
isolated balanced differential inputs allow
direct connection to any voltage up to
600 VRMS on both the positive and the negative
input of each channel.
The signal conditioner provides six channels of
voltage inputs from ± 20 mV to ± 1000 V. As a
result, this card combines small input ranges
with high voltage input ranges, all in one card.
The model uses two 4 mm safety banana plugs
for each channel. A standard safety rated BNCto-banana adapter can be used to easily
connect coax cables using BNCs.
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6 analog channels
Isolated, balanced differential
inputs
± 20 mV to ± 1000 V input range
600 VRMS CAT II isolation
User selectable digital Bessel,
Butterworth and Elliptic filters
2 MS/s sample rate
18 bit resolution
2 GB memory
Two 4 mm banana plugs for
each channel
Digital Event/Timer/Counter
support
To fulfill required safety standards this card has
been engineered to meet the international
standard IEC61010. Within the scope of this
standard this card offers CAT II 600 VRMS and
CAT III 300 VRMS isolation to allow safe
measurements within the most demanding
electrical environments.
Every channel is equipped with an
independent full range input amplifier, 7-pole
Bessel, Butterworth analog anti-aliasing filter,
user selectable digital Bessel, Butterworth and
Elliptic IIR filters, 18-bit Analog-to-Digital
converter operating at up to 2 MS/s.
If supported by the selected mainframe, the
GEN DAQ series input card offers 16 digital
input events, two digital output events and two
timer/counter channels.
Data sheet
GEN series
GN610
Capabilities Overview
Model
GN610
Maximum sample rate per channel
2 MS/s
Memory per card
2 GB
Analog channels
6
ADC resolution
18 bit
Digital Event/Timer/Counter support
yes
Isolation
yes; channel to channel and channel to chassis
Input type
Analog isolated balanced differential (1)
(1)
No probes supported
GEN series GN610 Block diagram
Figure 1.1: Block Diagram GEN series GN610
Note The listed specifications are valid for cards that are calibrated, and used in the same mainframe and slots as
they were at the time of calibration. When the card is removed from its original location and placed in another
slot and/or mainframe the following specifications are invalidated due to thermal differences within the
configurations: Offset error, Gain error and MSE. Typically the resulting specification will be double.
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Analog Input Section
Channels
6
Connectors
Fully isolated 4 mm banana plugs (Plastic), 2 per channel (red and black)
Input type
Analog isolated balanced differential
Input coupling
AC, DC, GND
Impedance
2 * 1 MΩ ± 1 % // 33 pF ± 10% ranges larger than ± 5 V. All other ranges 57 pF ± 10%
Ranges
± 20 mV, ± 50 mV, ± 0.1 V, ± 0.2 V, ± 0.5 V, ± 1 V, ± 2 V, ± 5 V, ± 10 V, ± 20 V, ± 50 V,
± 100 V, ± 200 V, ± 500 V, ± 1000 V
Offset
± 50 % in 1000 steps (0.1 %);
± 1000 V range has fixed 0 % offset
DC Offset error
Wideband
All IIR filters
Offset error drift
0.02 % of Full Scale ± 400 μV
0.02 % of Full Scale ± 10 μV
(±10 ppm + 2 μV)/°C ((±20 ppm + 2 μV)/°F)
DC Gain error
Wideband
0.1 % of Full Scale ± 20 μV
All IIR filters
0.1 % of Full Scale ± 10 μV
Gain error drift
± 15 ppm (±30 ppm/°F)
Maximum static error (MSE)
Wideband
0.075 % of Full Scale ± 400 μV
All IIR filters
0.075 % of Full Scale ± 10 μV
Wideband
0.035 % of Full Scale ± 50 μV
All IIR filters
0.035 % of Full Scale ± 50 μV
RMS Noise (50 Ω terminated)
Common Mode (referred to system ground)
Ranges
Rejection Ratio (CMRR)
Voltage
Less than or equal to ± 5 V
Larger than ± 5 V
> 80 dB @ 80 Hz
> 60 dB @ 80 Hz
7 VRMS
1000 VRMS
Input overload protection
Ranges
Maximum non destructive voltage
Less than or equal to ± 5 V
Larger than ± 5 V
± 1000 V DC
± 2000 V DC
Maximum overload without auto range
200 % of selected range
Auto range
When overload creates over heating of the amplifier, the amplifier will change its range up
in steps of factor 10 until overload disappears. When the actual overload is above 1000 V,
the amplifier will be grounded. When temperature returns to normal the original selected
range will be restored.
Overload recovery time
Restored to 0.1 % accuracy in less then TBD μs after 200 % overload
Isolation
CAT II
CAT III
Channel-to-chassis (earth)
1000 VRMS
600 VRMS
300 VRMS
Channel-to-channel
2000 VRMS
(1)
(1)
(1)
Channel to Channel CAT II and CAT III ratings are not a valid method to specify.
Analog to Digital Conversion
Sample rate; per channel
0.1 S/s to 2 MS/s
ADC resolution; one ADC per channel
18 bit
ADC type
Successive Approximation Register (SAR); Analog Devices AD7641BCPZ
Time base accuracy
Defined by mainframe: ± 3,5 ppm (1); aging after 10 years ± 10 ppm
Binary sample rate
Supported; when calculating FFT's produces rounded BIN values
Maximum binary sample rate
1.024 MS/s
External time base frequency
0 S/s to 1 MS/s
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Analog to Digital Conversion
External time base frequency divider
Divide external clock by 1 to 220
External time base level
TTL
External time base minimum pulse width
200 ns
(1)
Mainframes using Interface/Controller Modules shipped before 2012: ±30 ppm.
Amplifier Bandwidth and Filtering
Selection
Description
Wideband
When wideband is selected there is neither an analog anti alias filter, nor any digital filter in
the signal path. Therefore there is no anti alias protection when wideband is selected.
Should not be used if working in frequency domain with recorded data.
Bessel IIR
When Bessel IIR filter is selected, this is always a combination of an analog Bessel anti
alias filter and a digital Bessel IIR filter.
Bessel filters are typically used when looking at signals in the time domain. Best used for
measuring transient signals or sharp edge signals like square waves or step responses.
Butterworth IIR
When Butterworth IIR filter is selected, this is always a combination of an analog Butterworth
anti alias filter and a digital Butterworth IIR filter.
Best used when working in the frequency domain. When working in the time domain this
filter is best used for signals that are (close to) sine waves.
Elliptic IIR
When Elliptic IIR filter is selected, this is always a combination of an analog Butterworth anti
alias filter and a digital Elliptic IIR filter.
Best used when working in the frequency domain. When working in the time domain this
filter is best used for signals that are (close to) sine waves.
Wideband
When wideband is selected there is neither an analog anti alias filter, nor any digital filter in the signal path. Therefore there is no anti alias
protection when wideband is selected.
Wideband bandwidth
Pass band flatness
(1)
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Between 900 kHz and 1500 kHz (-3 dB)
TBD kHz (1)
Measured using a Fluke 5700 calibrator, DC normalized
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Bessel IIR Filter
Figure 1.2: Digital Bessel IIR Filter
When Bessel IIR filter is selected, this is always a combination of an analog Bessel anti alias filter and a digital Bessel IIR filter.
Analog anti aliasing filter bandwidth
Analog anti aliasing filter characteristic
Bessel IIR filter characteristic
8-pole Bessel style IIR
Bessel IIR filter user selection
Auto tracking to sample rate divided by: 10, 20, 40, 100
User selects divide factor from current sample rate, software then adjusts filter when sample
rate is changed
Bessel IIR filter bandwidth (ωc)
Pass band flatness (ωp)
Bessel IIR filter stop band attenuation (δs)
Bessel IIR filter roll-off
(1)
400 kHz ± 25 kHz (-3 dB)
7-pole Bessel, optimal step response
User selectable from 0.4 Hz to 200 kHz
TBD kHz (1)
-60 dB
-48 dB/octave
Measured using Fluke 5700 calibrator, DC normalized
Butterworth IIR Filter
Figure 1.3: Digital Butterworth IIR Filter
When Butterworth IIR filter is selected, this is always a combination of an analog Butterworth anti alias filter and a digital Butterworth IIR filter.
Analog anti aliasing filter bandwidth
Analog anti aliasing filter characteristic
Butterworth IIR filter characteristic
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450 kHz ± 25 kHz (-3 dB)
7-pole Butterworth, extended pass band response
8-pole Butterworth style IIR
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Butterworth IIR Filter
When Butterworth IIR filter is selected, this is always a combination of an analog Butterworth anti alias filter and a digital Butterworth IIR filter.
Butterworth IIR filter user selection
Butterworth IIR filter bandwidth (ωc)
Pass band flatness (ωp)
Butterworth IIR filter stop band attenuation (δs)
Butterworth IIR filter roll-off
Auto tracking to sample rate divided by: 4 (1), 10, 20, 40
User selects divide factor from current sample rate, software then adjusts filter when sample
rate is changed.
User selectable from 1 Hz to 250 kHz
TBD kHz (2)
-72 dB
-48 dB/octave
(1)
Divide by 4 not possible for sample rate 2 MS/s
(2)
Measured using Fluke 5700 calibrator, DC normalized
Elliptic IIR Filter
Figure 1.4: Digital Elliptic IIR Filter
When Elliptic IIR filter is selected, this is always a combination of an analog Butterworth anti alias filter and a digital Elliptic IIR filter.
Analog anti aliasing filter bandwidth
Analog anti aliasing filter characteristic
450 kHz ± 25 kHz (0.1 dB)
7-pole Butterworth, extended pass band response
Elliptic IIR filter characteristic
7-pole Elliptic style IIR
Elliptic IIR filter user selection
Auto tracking to sample rate divided by: 4 (1), 10, 20, 40
User selects divide factor from current sample rate, software then adjusts filter when sample
rate is changed
Elliptic IIR filter bandwidth (ωc)
Pass band flatness (ωp)
Elliptic IIR filter stop band attenuation (δs)
Elliptic IIR filter roll-off
User selectable from 10 Hz to 250 kHz
Full filter bandwidth (2)
-72 dB
-72 dB/octave
(1)
Divide by 4 not possible for sample rate 2 MS/s
(2)
Measured using Fluke 5700 calibrator, DC normalized
Channel to Channel Phase Match
Wideband
Channels on card
100 kHz Sine
800 kHz Sine
TBD deg (TBD μs)
TBD deg (TBD μs)
GN610 Channels within mainframe
Bessel IIR, Filter frequency 200 kHz @ 2 MS/s
Channels on card
TBD deg (TBD μs)
GN610 Channels within mainframe
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Channel to Channel Phase Match
Butterworth IIR, Filter frequency 200 kHz @ 2 MS/s
Channels on card
TBD deg (TBD μs)
GN610 Channels within mainframe
Elliptic IIR, Filter frequency 200 kHz @ 2 MS/s
Channels on card
TBD deg (TBD μs)
GN610 Channels within mainframe
GN610 channels across mainframes
Defined by synchronization method used (None, IRIG, GPS, Master/Slave)
On-board Memory
Per card
2 GB (1 GS @ 16 bits storage)
Organization
Automatic distributed amongst enabled channels
Memory diagnostics
Automatic memory test when system is powered and not recording
Storage sample size
16 bits, 2 bytes/sample
18 bits, 4 bytes/sample (required for Timer/Counter usage)
Digital Event/Timer/Counter (1)
Output power
5 ± 0.5 V DC @ 0.5 A
Digital input events
16 per card
Levels
TTL input levels, user programmable invert
Inputs
1 pin per input, some pins are shared with Timer/Counter inputs
Over voltage protection
± 30 V DC continuously
Minimum pulse width
100 ns
Maximum frequency
5 MHz
Digital output events
2 per card
Levels
TTL output levels, short circuit protected
Output event 1
User selectable: Trigger, Alarm, set High or Low
Output event 2
User selectable: Recording active, set High or Low
Digital output event user selections
Trigger
Alarm
Recording active
Set High or Low
Timer/Counter
1 high pulse per trigger (on every channel trigger of this card only)
12.8 µs minimum pulse width
200 µs ± 1 µs ± 1 sample period pulse delay
High when alarm condition is activated, low when not activated
Only outputs alarm conditions of this card
200 µs ± 1 µs ± 1 sample period alarm event delay
High when recording, low when in idle or pause mode
Recording active output delay 450 ns
Output set High or Low
Can be controlled by Custom Software Interface (CSI) extensions
Delay depending on specific software implementation
2 per card
Levels
TTL input levels
Inputs
All pins are shared with digital event inputs
Timer-Counter modes
Uni- and bi-directional count
Bi-directional quadrature count
Uni- and bi-directional frequency/RPM measurement
Uni- and bi-directional count
Inputs
Maximum input frequency
Maximum count value
Reset input
Reset options
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3 pins; signal, direction and reset
5 MHz
0 to 232
User selectable level invert
Manual: On user request by software command
Start recording: Count value set to 0 at start of recording
First reset pulse: After start of recording the first reset pulse sets counter value to 0. Next
reset pulses are ignored.
Each reset pulse: On each external reset pulse the counter value is reset to 0.
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Digital Event/Timer/Counter (1)
Bi-directional quadrature count
Inputs
Maximum input frequency
Accuracy
Maximum count value
Reset input
Reset options
3 pins; signal, direction and reset
2 MHz, minimum high or low time 200 ns. Minimum phase difference between signal and
direction 100 ns.
Single, dual and quad precision
0 to 232
User selectable level invert
Manual: On user request by software command
Start recording: Count value set to 0 at start of recording
First reset pulse: After start of recording the first reset pulse sets counter value to 0. Next
reset pulses are ignored.
Each reset pulse: On each external reset pulse the counter value is reset to 0.
Uni- and bi-directional frequency/RPM measurement
Inputs
Maximum input frequency
Accuracy
Gate measuring time
Direction pin
(1)
2 pins; signal, direction
5 MHz
0.1 %
5 µs to 50 s
User selectable to control update rate independent of sample rate
To indicate positive or negative (left or right) rotations
Low: Positive frequency/RPM
High: Negative frequency/RPM
Only used when in bi-directional frequency/RPM mode
Only if supported by mainframe
Triggering
Channel trigger/qualifier
1 fully independent per channel either trigger or qualifier
Pre- and post-trigger length
0 to full memory
Trigger rate
400 triggers per second
Delayed trigger
Maximum 1000 seconds after a trigger occurred
Manual trigger (Software)
Supported
External trigger in
Selection per card
Trigger in edge
Minimum pulse width
User selectable On/Off
Rising/Falling mainframe selectable, identical for all cards
500 ns
Trigger in delay
± 1 µs + maximum 1 sample period (Identical for decimal and binary timebase)
Send to external trigger out
User can select to forward External Trigger In to the External Trigger Out BNC
External trigger out
Selection per card
Trigger out level
Trigger out pulse width
Trigger out delay
User selectable On/Off
High/Low/Hold High mainframe selectable, identical for all cards
High/Low: 12.8 µs
Hold High: Active from first mainframe trigger to end of recording
Pulse width created by mainframe; see mainframe datasheet for details
516 µs ± 1 µs + maximum 1 sample period using decimal time base
504 µs ± 1 µs + maximum 1 sample period using binary time base
Cross channel triggering
Channels on card
Cards in mainframe
Logical OR; analog triggers of all channels
Logical AND; qualifiers of all channels
User selectable through system trigger bus
Selections: Send/Receive/Transceive (Send & Receive)
System trigger bus
Connections
Operation
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3 System trigger busses connecting all cards within mainframe
1 Master/Slave bus connecting all cards within mainframe and connecting all mainframes
when using Master/Slave option
Logical OR of all triggers of all cards
Logical AND of all qualifiers of all cards
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Triggering
Analog channel trigger levels
Levels
Resolution
Direction
Hysteresis
Maximum 2 level detectors
16 bit (0.0015 %); for each level
Rising/Falling; single direction control for both levels based on selected mode
0.1 to 100 % of Full Scale; defines the trigger sensitivity
Analog channel trigger modes
Basic
Dual level
POS or NEG crossing; single level
One POS and one NEG crossing; two individual levels, OR-ed
Analog channel qualifier modes
Basic
Dual (level)
Above or below level check. Enable/Disable trigger with single level
Outside or within bounds check. Enable/Disable trigger with dual level
Event channel trigger (1)
Event channels
Levels
Qualifiers
(1)
Individual event trigger per event channel
Trigger on rising edge or trigger on falling edge
Active High or Active Low for every event channel
Only if supported by mainframe
Alarm Output
Selection per Card
User selectable On/Off
Alarm modes
Basic or Dual
Basic
Dual (level)
Above or below level check
Outside or within bounds check
Alarm levels
Levels
Resolution
Maximum 2 level detectors
16 bit (0.0015 %); for each level
Alarm output
Active during valid alarm condition, output supported through mainframe
Alarm output delay
515 µs ± 1 µs + maximum 1 sample period using decimal timebase
503 µs ± 1 µs + maximum 1 sample period using binary timebase
Real-Time Analysis
Analysis
StatStream®
Patent Number : 7,868,886
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Description
Each channel includes real-time extraction of Maximum, Minimum, Mean, Peak-to-Peak,
Standard Deviation and RMS values
Supports the real-time Live scrolling and scoping waveform displays as well as the real-time
meters during recording
Supports the fast displaying and zooming within extremely large recordings
Supports the fast calculation of statistical channel information
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Acquisition Modes
Mode
Description
Single sweep
Triggered acquisition to on-board memory without sample rate limitations; for single
transients or intermittent phenomena.
Multiple sweeps
Triggered acquisition to on-board memory without sample rate limitations; for repetitive
transients or intermittent phenomena.
Slow fast sweep
Identical to single sweep acquisition with additional support for fast sample rate switches
during the post trigger segment of the slow rate single sweep settings.
Continuous
Direct storage to PC or mainframe hard disk without file size limitations; triggered or untriggered; for long duration recorder type applications.
Dual
Combination of Multiple sweeps and Continuous; recorder type streaming to hard disk with
simultaneously triggered sweeps in on-board memory.
Single Sweep
Sweep memory
954 MS; 16 bit resolution; used by enabled channels only
477 MS; 18 bit resolution; used by enabled channels only
Maximum sweep length
16 bit resolution
1 Channel
6 Channels
6 Channels + Event channel(s)
954 MS
159 MS
136 MS
1 Channel
6 Channels
6 Channels + Events + Timer/Counters
477 MS
79 MS
53 MS
18 bit resolution
Maximum sample rate
2 MS/s per channel, no aggregate streaming rate limitations
Pre-trigger segment
0 % to 100 % of selected sweep length
If trigger occurs before pre-trigger segment is recorded, pre-trigger segment is truncated to
recorded data only
Delayed trigger
Maximum 1000 seconds after a trigger occurred. Sweep is recorded immediately after
delayed trigger time with 100 % post trigger after this time point
Sweep stretch
User selectable On/Off
When enabled any new trigger event occurring in the post-trigger segment of the sweep will
restart the post-trigger length. If upon the detection of a new trigger, the extended posttrigger doesn’t fit within the sweep memory, sweep stretch will not happen. Maximum sweep
stretch rate 1 sweep stretch per 2.5 ms
Multiple Sweeps
Sweep memory
954 MS; 16 bit resolution; used by enabled channels only
477 MS; 18 bit resolution; used by enabled channels only
Maximum sweep length
16 bit resolution
1 Channel
6 Channels
6 Channels + Event channel(s)
954 MS
159 MS
136 MS
1 Channel
6 Channels
6 Channels + Events + Timer/Counters
477 MS
79 MS
53 MS
18 bit resolution
Maximum sample rate
2 MS/s per channel, no aggregate streaming rate limitations
Pre-trigger segment
0 % to 100 % of selected sweep length
If trigger occurs before pre-trigger segment is recorded, pre-trigger segment is truncated to
recorded data only
Delayed trigger
Maximum 1000 seconds after a trigger occurred. Sweep is recorded immediately after
delayed trigger time with 100 % post trigger after this time point
Maximum number of sweeps
200 000 per recording
Maximum sweep rate
400 sweeps per second
Sweep re-arm time
Zero re-arm time, sweep rate limited to 1 sweep per 2.5 ms
Sweep stretch
User selectable On/Off
When enabled any new trigger event occurring in the post-trigger segment of the sweep will
restart the post-trigger length. If upon the detection of a new trigger, the extended posttrigger doesn’t fit within the sweep memory, sweep stretch will not happen. Maximum sweep
stretch rate 1 sweep stretch per 2.5 ms.
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Multiple Sweeps
Sweep storage
Sweep storage starts immediately after the trigger for this sweep is detected. Sweep
memory becomes available for reuse as soon as storage of the entire sweep for all enabled
channels of this card has been completed. Sweeps will be stored one by one starting with
the first recorded sweep.
Sweep storage rate
Determined by total number of selected channels and mainframes, mainframe type,
Ethernet speed, PC storage medium and other PC parameters; see mainframe datasheet
for details
Exceeding sweep storage rate
Trigger event makers are stored in recording, no sweep data stored. New sweep data
recorded as soon as enough internal memory is available to capture a full sweep when
trigger occurs.
Slow Fast Sweep
Maximum number of Sweeps
1
Sweep memory
954 MS; 16 bit resolution; used by enabled channels only
477 MS; 18 bit resolution; used by enabled channels only
Maximum sweep length
16 bit resolution
1 Channel
6 Channels
6 Channels + Event channel(s)
954 MS
159 MS
136 MS
18 bit resolution
1 Channel
6 Channels
6 Channels + Events + Timer/Counters
477 MS
79 MS
53 MS
Maximum fast sample rate
2 MS/s per channel, no aggregate rate limitations
Maximum slow sample rate
Fast sample rate divided by 2
Maximum fast sample rate switches
400 sample rate switches per second, 200 000 switches maximum, switching stops when
sweep ends
Continuous
Continuous modes supported
Standard, Circular recording, Specified time and Stop on trigger
Standard
Circular recording
User starts and stops recording. Automatic recording stop on storage media full.
User specified recording history on storage media. All recorded data stores as quickly as
possible on selected storage media. As soon as selected history time is reached older
recorded data is overwritten. Recording can be stopped by user, or any system trigger.
Specified time
Automatic recording stop after user specified time or on storage media full
Stop on trigger
Automatic recording stop after any system trigger or on storage media full
Continuous FIFO memory
954 MS; 16 bit resolution; used by enabled channels to optimize continuous streaming rate
477 MS; 18 bit resolution; used by enabled channels to optimize continuous streaming rate
Maximum sample rate
2 MS/s per channel
Maximum streaming rate
16 bit resolution
1 Channel
6 Channels
6 Channels + Event channel(s)
2 MS/s (4 MB/s)
12 MS/s (24 MB/s)
14 MS/s (28 MB/s)
1 Channel
6 Channels
6 Channels + Events + Timer/Counters
2 MS/s (8 MB/s)
12 MS/s (48 MB/s)
18 MS/s (72 MB/s)
18 bit resolution
Maximum recording time
Until storage media filled, or user selected time or unlimited using circular recording
Maximum aggregate streaming rate per
mainframe
Determined by mainframe, Ethernet speed, PC storage medium and other PC parameters;
see mainframe datasheet for details
Exceeding aggregate streaming rate
When using a streaming rate selected higher than the aggregate streaming rate of the
system, the continuous memory will act as a FIFO. As soon as this FIFO fills up, the
recording suspends (temporarily no data is recorded). During this period, the internal FIFO
memory is transferred to storage medium. When internal memory is completely empty
again, the recording automatically resumes. User notifications added to recording file for
post recording identification of storage overrun.
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Dual
Dual Sweep Specification
Sweep memory
762 MS; 16 bit resolution; used by enabled channels only
381 MS; 18 bit resolution; used by enabled channels only
Maximum sweep length
16 bit resolution
1 Channel
6 Channels
6 Channels + Event channel(s)
762 MS
126 MS
108 MS
1 Channel
6 Channels
6 Channels + Events + Timer/Counters
381 MS
63 MS
42 MS
18 bit resolution
Maximum sample rate
2 MS/s per channel, no aggregate streaming rate limitations
Pre-trigger segment
0 % to 100 % of selected sweep length
If trigger occurs before pre-trigger segment is recorded, pre-trigger segment is truncated to
recorded data only
Delayed trigger
Maximum 1000 seconds after a trigger occurred. Sweep is recorded immediately after
delayed trigger time with 100 % post trigger after this time point.
Maximum number of sweeps
200 000 recording
Maximum sweep rate
400 triggers per second
Sweep re-arm time
Zero re-arm time, sweep rate limited to 1 sweep per 2.5 ms
Sweep stretch
User selectable On/Off
When enabled any new trigger event occurring in the post-trigger segment of the sweep will
restart the post-trigger length. If upon the detection of a new trigger, the extended posttrigger doesn’t fit within the sweep memory, sweep stretch will not happen. Maximum
sweepstretch rate 1 sweep stretch per 2.5 ms
Sweep storage
In dual mode the storage of the continuous data is prioritized above the storage of the sweep
data. If enough storage rate is available, the sweep storage starts immediately after the
trigger for this sweep is detected. Sweep memory becomes available for reuse as soon as
storage of the entire sweep for all enabled channels of this card has been completed.
Sweeps will be stored one by one starting with the first recorded sweep.
Sweep storage rate
Determined by continuous sample rate, total number of channels and mainframes,
mainframe type, Ethernet speed, PC storage medium and other PC parameters. See
mainframe datasheet for details.
Exceeding sweep storage rate
Continuous recorded data not stopped, trigger events are stored in recording, no new sweep
data stored. New sweep recorded as soon as enough internal memory is available to
capture a full sweep when trigger occurs.
Dual Continuous Specifications
Continuous FIFO memory
190 MS; 16 bit resolution; used by enabled channels to optimize continuous streaming rate
95 MS; 18 bit resolution; used by enabled channels to optimize continuous streaming rate
Maximum sample rate
Sweep sample rate divide by 2
Maximum streaming rate
16 bit resolution
1 Channel
6 Channels
6 Channels + Event channel(s)
2 MS/s (4 MB/s)
12 MS/s (24 MB/s)
14 MS/s (28 MB/s)
1 Channel
6 Channels
6 Channels + Events + Timer/Counters
2 MS/s (8 MB/s)
12 MS/s (48 MB/s)
18 MS/s (72 MB/s)
18 bit resolution
Maximum recording time
Until storage media filled, all recorded data will be stored including sweeps, or user selected
time
Maximum aggregate streaming rate per
mainframe
Determined by used mainframe, Ethernet speed, PC storage medium and other PC
parameters; see mainframe datasheet for details
When exceeding average aggregate streaming rate, sweep storage speed is automatically
reduced to increase aggregate streaming rate, until sweep storage completely stops.
Exceeding aggregate storage rate
When using a streaming rate selected higher than the aggregate streaming rate of the
system, the continuous memory will act as a FIFO. As soon as this FIFO fills up, the
recording suspends (temporarily no data is recorded). During this period, the internal FIFO
memory is transferred to storage medium. When internal memory (Continuous and Sweep
memory) is completely empty again, the recording automatically resumes. User notifications
added to recording file for post recording identification of storage overrun.
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Environmental Specifications
Temperature Range
Operational
Non-operational (Storage)
Thermal protection
0 °C to +40 °C (+32 °F to +104 °F)
-25 °C to +70 °C (-13 °F to +158 °F)
Automatic thermal shutdown at 85 °C (+185 °F) internal temperature
User warning notifications at 75 °C (+167 °F) (Supported by Perception V6.30 or higher)
Relative humidity
0 % to 80 %; non-condensing; operational
Protection class
IP20
Altitude
Maximum 2000 m (6562 feet); operational
Shock: IEC 60068-2-27
Operational
Non-operational
Half-sine 10 g/11 ms; 3-axis, 1000 shocks in positive and negative direction
Half-sine 25 g/6 ms; 3-axis, 3 shocks in positive and negative direction
Vibration: IEC 60068-2-34
Operational
1 g RMS, ½ h; 3-axis, random 5 to 500 Hz
Non-operational
2 g RMS, 1 h; 3-axis, random 5 to 500 Hz
Operational Environmental Tests
Cold test IEC60068-2-1 Test Ad
Dry heat test IEC-60068-2-2 Test Bd
Damp heat test IEC60068-2-3 Test Ca
-5 °C (+23 °F) for 2 hours
+40 °C (+104 °F) for 2 hours
+40 °C (+104 °F), humidity >93 % RH for 4 days
Non-Operational (Storage) Environmental Tests
Cold test IEC-60068-2-1 Test Ab
Dry heat test IEC-60068-2-2 Test Bb
Change of temperature test
IEC60068-2-14 Test Na
Damp heat cyclic test
IEC60068-2-30 Test Db variant 1
-25 °C (-13 °F) for 72 hours
+70 °C (+158 °F) humidity <50 % RH for 96 hours
-25 °C to +70 °C (-13 °F to +158 °F)
5 cycles, rate 2 to 3 minutes, dwell time 3 hours
+25 °C/+40 °C (+77 °F/+104 °F), humidity >95/90 % RH
6 Cycles, cycle duration 24 hours
Harmonized Standards for CE Compliance, according to the following directives
Low voltage directive (LVD): 2006/95/EC
Electromagnetic compatibility directive (EMC): 2004/108/EC
Electrical Safety
EN 61010-1 (2010)
Safety requirements for electrical equipment for measurement, control, and laboratory use
- General requirements
EN 61010-2-030 (2010)
Particular requirements for testing and measuring circuits
Electromagnetic Compatibility
EN 61326-1 (2006)
Electrical equipment for measurement, control and laboratory use - EMC requirements Part 1: General requirements
EMISSION
EN 55011
Industrial, scientific and medical equipment - Radio-frequency disturbance characteristics
- Limits and methods of measurement
Conducted disturbance: class B; Radiated disturbance: class A
EN 61000-3-2
Limits for harmonic current emissions: class D
EN 61000-3-3
Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply
systems
IMMUNITY
EN 61000-4-2
Electrostatic discharge immunity test (ESD);
contact discharge ± 4 kV/air discharge ± 8 kV: performance criteria B
EN 61000-4-3
Radiated, radio-frequency, electromagnetic field immunity test;
80 to 2700 MHz using 10 V/m, 1000 Hz AM: performance criteria A
EN 61000-4-4
Electrical fast transient/burst immunity test
Mains ± 2 kV using coupling network. Channel ± 2 kV using capacitive clamp: performance
criteria B
EN 61000-4-5
Surge immunity test
Mains ± 0.5 kV/± 1 kV Line-Line and ± 0.5 kV/± 1 kV/± 2 kV Line-earth Channel ± 0.5 kV/
± 1 kV using coupling network: performance criteria B
B3618-1.0 en
13
HBM
Harmonized Standards for CE Compliance, according to the following directives
Low voltage directive (LVD): 2006/95/EC
Electromagnetic compatibility directive (EMC): 2004/108/EC
EN 61000-4-6
Immunity to conducted disturbances, induced by radio-frequency fields 0.15 to 80 MHz,
1000 Hz AM; using clamp; mains 10 V RMS using clamp, channel 3 V RMS: performance
criteria A
EN 61000-4-11
Voltage dips, short interruptions and voltage variations immunity tests
Dips: performance criteria A; Interruptions: performance criteria C
Ordering information (1)
Article
Basic 1 kV ISO
2 MS/s
(1)
Description
Order No.
6 channel, 18 bit, 2 MS/s, ± 20 mV to ± 1000 V input range,
2 GB RAM, 1 kV isolated balanced differential input
(600 VRMS CAT II isolation), 4 mm fully isolated banana plugs
1-GN610-2
GN610 not supported in any Perception version prior to V6.30.
Accessories, to be ordered separately
Article
Description
Order No.
BNC to banana
adapter
Set of six pieces, safety isolated female BNC to dual 4 mm
protected banana adaptor.
1000 V CATII, 600 V CATIII and 1 A current safety ratings. Can
be used with GN610 and GN611 input cards.
1-G067-2
Artificial neutral
box
The virtual/artificial neutral box is a plug-on interface card for
measuring 3 phase signals with the high voltage cards
1-GN610-2 and 1-GN611-2. This card is intended for
measuring 3 phase signals while creating a virtual/artificial
neutral.
1-G068-2
Test Leads and
clips
Black/red lead set (CAT II, 600 V), 1.5 meter (4.9 feet) with
safety-shrouded banana plugs and alligator clips
1-KAB282-1.5
HBM
14
B3618-1.0 en
Hottinger Baldwin Messtechnik GmbH
Im Tiefen See 45 ∙ 64293 Darmstadt ∙ Germany
Tel. +49 6151 803-0 ∙ Fax: +49 6151 803-9100
E-mail: info@hbm.com ∙ www.hbm.com
measure and predict with confidence
B3618-1.0 en
©Hottinger Baldwin Messtechnik GmbH. All rights reserved.
All details describe our products in general form only.
They are not to be understood as express warranty and do
not constitute any liability whatsoever.
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