Test Equipment Solutions Datasheet
Test Equipment Solutions Ltd specialise in the second user sale, rental and distribution of
quality test & measurement (T&M) equipment. We stock all major equipment types such as
spectrum analyzers, signal generators, oscilloscopes, power meters, logic analysers etc from
all the major suppliers such as Agilent, Tektronix, Anritsu and Rohde & Schwarz.
We are focused at the professional end of the marketplace, primarily working with customers
for whom high performance, quality and service are key, whilst realising the cost savings that
second user equipment offers. As such, we fully test & refurbish equipment in our in-house,
traceable Lab. Items are supplied with manuals, accessories and typically a full no-quibble 2
year warranty. Our staff have extensive backgrounds in T&M, totalling over 150 years of
combined experience, which enables us to deliver industry-leading service and support. We
endeavour to be customer focused in every way right down to the detail, such as offering free
delivery on sales, covering the cost of warranty returns BOTH ways (plus supplying a loan
unit, if available) and supplying a free business tool with every order.
As well as the headline benefit of cost saving, second user offers shorter lead times, higher
reliability and multivendor solutions. Rental, of course, is ideal for shorter term needs and
offers fast delivery, flexibility, try-before-you-buy, zero capital expenditure, lower risk and off
balance sheet accounting. Both second user and rental improve the key business measure of
Return On Capital Employed.
We are based near Heathrow Airport in the UK from where we supply test equipment
worldwide. Our facility incorporates Sales, Support, Admin, Logistics and our own in-house
Lab.
All products supplied by Test Equipment Solutions include:
- No-quibble parts & labour warranty (we provide transport for UK mainland addresses).
- Free loan equipment during warranty repair, if available.
- Full electrical, mechanical and safety refurbishment in our in-house Lab.
- Certificate of Conformance (calibration available on request).
- Manuals and accessories required for normal operation.
- Free insured delivery to your UK mainland address (sales).
- Support from our team of seasoned Test & Measurement engineers.
- ISO9001 quality assurance.
Test equipment Solutions Ltd
Unit 8 Elder Way
Waterside Drive
Langley
Berkshire
SL3 6EP
T: +44 (0)1753 596000
F: +44 (0)1753 596001
Email: info@TestEquipmentHQ.com
Web: www.TestEquipmentHQ.com
LCR Meters
4260, 4265, 4270
Providing low cost, straightforward
and accurate measurement of
components - in a service,
production or laboratory
environment.
Three low cost versatile
models - the 4270, 4265 and
4260 - offer a combination of
powerful capabilities to meet
the most demanding
requirements, quickly and
effectively.
Features
●
Comprehensive measurement
functions, including DC Resistance
●
Test components to 1MHz
●
Large LCD display, with easy-to-read
characters
●
0.1% basic accuracy
●
IEEE-488 or RS-232 interface
●
DC Voltage bias
●
9 instrument setups stored
●
Display of actual Voltage and Current
measurement
●
Automatic zero trim
●
Contact check
●
Deviation measurement mode
●
Directly print measured data
High performance... excellent value for money
The 4200 series combines superior performance, measurement functions and a
low price providing unbeatable value for money. Operation is simple and
straightforward with measurements undertaken at a wide range of test frequencies
and voltage levels. Features include a choice of interfaces - IEEE-488 or RS-232,
comprehensive measurement functions, including DC Resistance, a bin handling
capability and component characterisation to 1 MHz.
Fast, accurate, repeatable
measurements
Testing electronic components with Wayne Kerr LCR
meters is easy, and in less than a second you’ll see
all you need to know on the large, easy-to-read LCD
display. The dominant component value can be
measured with a basic accuracy of 0.1% and
displayed with its equivalent circuit diagram.
Measurement integrity is further enhanced with the
use of Kelvin leads or test posts which connect
directly onto the instrument’s front panel.
Comprehensive measurement
functions to suit all
requirements
The 4200 series LCR meters offer a comprehensive
range of measurement functions: series and parallel
resistance (Rac), DC resistance (Rdc), capacitance
(C), inductance (L), impedance (Z), phase angle (ø),
dissipation factor (D) and quality factor (Q) can all be
selected. An internal DC bias source is provided for
testing components such as electrolytic capacitors
and semiconductor junctions.
For the un-skilled user, just connect the component
you want to test into the test posts and the LCR
meter will automatically sense the type of
component being tested and display the
characteristic parameters and equivalent circuit on
the large LCD display. To get a more stable reading
you can use the averaging function. For fast
comparison of components, the 4270 also offers a
deviation mode.
Select the current/voltage monitoring function to see
the actual test current and voltage values measured
at the component under test. This ensures
maximum protection for current-sensitive
components and allows the test current to be
specified together with the measured component
parameters.
Quick and simple component
connection
Precise component characterisation to 1 MHz
The 4270 and 4265 have the widest choice of test frequencies. For testing primary
power components such as transformers and filter capacitors, these instruments
have 50 and 60 Hz test frequencies together with the 100 and 120 Hz ripple
frequencies. In the 100 Hz to 20 kHz range, both LCR meters provide 100 Hz
resolution for precision frequency characterisation. For testing small value capacitors,
100 kHz is also provided in the 4265, while the test frequency of the 4270 is
continuously adjustable up to 1 MHz.
Component test voltage levels are variable from 2V right down to only 50 mV, to
keep sensitive semi-conductor junctions below their voltage thresholds. DC bias can
be added, either from the built-in source or from an external source up to 40 V DC.
Connection of test components is quick and simple;
either directly to the detachable test posts which are
conveniently located on the front panel, or using the
9542A universal test adapter. The optional 9541B
test cable with Kelvin clips provides a unique solution
for flexible attachment to mounted components
while retaining the extra accuracy of the 4-wire
measurement principle.
Surface-mount devices (SMDs) are also handled
quickly and efficiently, using the optional SMD
accessories. All measurements are made using a
4-wire technique which ensures accurate and
repeatable measurements - even for low-impedance
components.
Wide accessory range for easy
connection to a variety of
components
Testing surface-mount devices has always been a
challenge because of their size, no wire leads, and
tiny or no markings. These factors make it more
important to be able to test SMD components to
control their quality and prevent misloads in a
manufacturing environment. The Wayne Kerr
accessories for SMD testing are uniquely designed
and allow fast, convenient and accurate
characterization of these components.
Automatically sorts
components with different
tolerance levels
The binning function allows components to be sorted
into ten bins. By inserting the component in the test
fixture, the indicated bin number can be read from
the display. The optional handler interface provides
lamp drivers for a visual indication of the proper bin,
or a pass/fail indication, along with an external
measurement trigger input, further speeding up the
sorting process.
4265 Automatic LCR Meter
DC - 100 kHz
Flexible, full remote control
With the IEEE-488 interface, the 4270 and 4265 can
become the heart of a fully automated component
testing environment for operation at up to 10
measurements per second. Or with the RS-232
interface, the tester can be controlled simply and
economically from a PC in a standalone system for
incoming inspection of components and devices.
Produce a hard copy
of measurement results
Using the RS-232 interface measurement results can
be output directly to a printer.
Suitable for all environments
With so many built-in capabilities, the compact and
versatile Wayne Kerr 4200 series LCR meters can be
used in service, laboratory or production
environments. And with the best measurement
versatility and value in their class, they are sure to
prove a valuable addition where low cost
straightforward testing is required and component
accuracy and reliability are essential.
LCR Meters
4260 4265 4270
Products at a glance
The Wayne Kerr 4200 series
comprises three models to meet
4270 Automatic LCR Meter
DC - 1 MHz
a wide range of performance
and budget requirements:
4270 Automatic LCR Meter
DC - 1 MHz
The 4270 is the most versatile LCR meter in the
family. It allows testing at any frequency up to
1 MHz, variable AC and DC test voltages, deviation
mode and is capable of handling a wide variety of
components under realistic test conditions.
4265 Automatic LCR Meter
DC - 100 kHz
For testing to 100 kHz consider the 4265. It has a
basic accuracy of 0.1%, 3 test voltage levels and 204
test frequencies, providing a powerful yet low cost
solution to component testing.
4260 Automatic LCR Meter
1 kHz
4260 Automatic LCR Meter
1 kHz
The simplest and most cost effective solution to
component testing. The 4260 has a 0.25% basic
accuracy and is ideal for use in manufacturing as a
quality assurance tool, or in the service lab for quick
tests on a wide variety of components. It’s equally at
home in the classroom for education, or in training
environments.
Select the Wayne Kerr LCR meter that’s right for
your application:
Function
Frequency range
Measurement functions
Basic accuracy
AC test signal level
DC bias (Voltage)
Contact check
Averaging
Deviation mode
Test signal monitoring
Remote interface
4270
50 Hz – 1 MHz
Z, Rac, L, C, Q, D, φ, Vx,
Ix, ∆%, Series & Parallel.
Rdc (opt)
0.1%
50 mV – 2 V
0 – 10 V int.,
< 40 V ext.
Yes
Yes (3 levels)
Yes
Current or voltage
IEEE-488 or RS-232
4265
50 Hz – 100 kHz
Z, Rac, L, C, Q, D, φ, Vx,
Ix, Series & Parallel.
Rdc (opt)
0.1%
50 mV, 1 V, 2 V
2 V int.,
< 40 V ext.
–
Yes
–
Current or voltage
IEEE-488 or RS-232
4260
1 kHz
Z, Rac, L, C, Q, D, φ,
Series & Parallel.
0.25%
2V
2 V int.
–
–
–
–
–
T E C H N I C A L S P E C I F I C AT I O N S
4260
AC test mode
Test frequency
Test frequency accuracy
Test signal level
Basic measurement
accuracy
DC bias
Internal
4270
1 kHz
0.025%
2V via 400 Ω source
AC Test mode
Test frequency
4265
50, 60, 100, 120 Hz
50, 60, 100, 120 Hz
200 Hz to 100 kHz (100 Hz
200 Hz to 20 kHz (100 Hz steps)
steps) 100 kHz to 1 MHz (1 kHz 100 kHz
steps)
0.25% ±1 digit
2V
Maximum measuring ranges
Impedance/Resistance Z or
Rac 0.000 Ω to 200 MΩ
Capacitance
C 0.0 pF to 100 mF
Inductance
L 0.0 µH to 32 kH
Quality factor
Q 0.002 to 500
Dissipation factor
D 0.002 to 500
Phase angle
φ –90.0 to +90.0 deg
Test frequency accuracy
Test signal levels
0.01 %
50 mV to 2 V (10 mV steps)
via 100 Ω
0.01%
50 mV via 100 Ω
1 V via 100 Ω
2 V via 400 Ω
Basic measurement accuracy at 0.1% ± 1 digit
normal measurement mode
(for ≥ 0.25 V, ≤ 50 kHz)
0.1% x (f / 50 kHz) ± 1 digit
(for ≥ 0.25 V, > 50 kHz)
0.1% x (O.25 V/VT) ± 1 digit
(for < 0.25 V, ≤ 50 kHz)
0.1% ± 1 digit (for ≤ 20 kHz)
0.4% ± 1 digit (100 kHz)
0.5% ± 1 digit (for 50 mV, ≤ 20
kHz)
2.0% ± 1 digit (for 50 mV, 100
kHz)
Maximum resolution
Impedance/Resistance Z or
Rac 0.1 mΩ
Capacitance
C 0.1 pF
Inductance
L 0.1 µH
Quality factor
Q 0.001
Dissipation factor
D 0.001
Phase angle
φ 0.1 deg
DC bias
Internal
External
0 to 10 V (0.1 V steps)
0 to 40 V
2V
0 to 40 V
50 mV to 2 V (10 mV steps) via
100 Ω
300 mV via 100 Ω
1 V via 100 Ω
2 V via 400 Ω
Circuit diagram
7 different equivalent
circuit diagrams
Basic measurement accuracy at 0.1% ± 1 digit
normal measurement mode
(for ≥ 0.25 V)
Auto mode
Read-out
Equivalent circuit diagram
Manual mode
Read out
Equivalent circuit diagram
Dominant parameter
Parallel for R+C
Serial for R+L
Dominant or secondary
parameter
Parallel or serial
selectable
Measurement
update rate
2 measurements/s
Trim function
Open circuit
Short circuit
Open circuit
compensation Z > 100 kΩ
Short circuit compensation
Z < 10 Ω
Stored settings
(non-volatile memory)
Front panel settings
1 (trim figures included)
Calibration
Calibration interval
1 year
Environmental conditions
Operating temperature
Storage temperature
Power requirements
Line frequency
Power consumption
EMC
Safety
Warm-up time
Dimensions and weight
WxHxD
Weight
0°C to 50°C
–40°C to 70°C
100/120/220/240 V ±10%
50 to 100 Hz
16 VA
VDE 0871 Class B,
CISPR 11
According to CE-regulation
73/23 EN61010 CAT II,
CSA C22.2 No. 231
5 minutes
DC Test mode (Optional)
Test signal levels
Contact Check (4270 only)
Pass
Fail
0.1% ± 1 digit (for 1 V)
<3Ω
≥ 3 Ω (with indication of failed
connection lead)
-
Maximum measuring ranges
Impedance/ Resistance AC Z or
RAC
Resistance DC
RDC
Capacitance
C
Inductance
L
Quality factor
Q
Dissipation factor
D
Phase angle
φ
Voltage monitor
VX
Current monitor
IX
0.0000 Ω to 200 MΩ
0.0000 Ω to 50 MΩ
0.00 pF to 31.8 F
0.00 µH to 637 kH
0.000 to 1000
0.000 to 1000
–179 to +180 deg
0.1 µV to 2.00 V
0.005 µA to 10.0 mA
Maximum resolution
Impedance/ Resistance AC Z or
RAC
Resistance DC
RDC
Capacitance
C
Inductance
L
Quality factor
Q
Dissipation factor
D
Phase angle
φ
Voltage monitor
VX
Current monitor
IX
0.1 mΩ
0.1 mΩ
0.01 pF
0.01 µH
0.001
0.001
0.1 deg
0.1 µV
0.001 µA
Circuit diagram
Display
Auto mode
Read-out
Equivalent circuit diagram
Manual mode
Read-out
Equivalent circuit diagram
315 x 105 x 405 mm
(12.4” x 4.13” x 15.9”)
Average function
Function
3.8 kg /8.4 lb
Levels
1 of 7 different equivalent circuit diagrams
Dominant and secondary parameter
Parallel for R+C, Serial for R+L
Dominant and secondary parameter or
Z, φ, D, Q, VX , IX
Parallel or serial selectable
Exponential averaging in continuous mode
3 (and off)
1 (and off)
Deviation mode (4270 only)
Relative range in respect to
reference value
Measuring modes
Normal
Continuous
Single
4270
4265
–100% to +100%
-
2 measurements/s
Triggered via “TRIG” key,
Triggered via handler interface
Triggered via IEEE-488 or RS-232
Test frequency
50, 60, 100, 120 Hz
200 Hz to 100 kHz (100 Hz steps)
100 kHz to 1 MHz (1 kHz steps)
DC (optional)
50, 60, 100, 120 Hz
200 Hz to 20 kHz (100 Hz steps)
100 kHz
DC (optional)
Read-out
Display or via IEEE-488 or RS-232 interface
Fast
Max. speed
10 measurements/s
Test frequency
Single
Read-out
200 Hz to 100 kHz (200 Hz steps)
100 kHz to 1 MHz (1 kHz steps)
DC (optional)
Triggered via handler interface
Triggered via IEEE-488 or RS-232
Via IEEE or RS-232 interface (display blanked)
Binning
Standard bins
Special bins
Bin programming via
Protection against charged
capacitors
C < 2 µF
2 µF ≤C ≤2 mF
C > 2 mF
Stored settings
(non-volatile memory)
Front panel settings
Bin settings
Print measurement results
EMC
Safety
1 year
Warm-up time
Dimensions and weight
WxHxD
Weight
/A RS-232 Interface (cannot be fitted
with option /B)
/B IEEE-488 Interface (cannot be fitted
with option /A)
/C DC Test
/D Handler Interface
1J4270
Automatic LCR Meter DC-1 MHz with
RS-232 Interface
Supplied with User Manual and AC
Power cable
Accessories
9536/041
RS-232 Cable 3m, 9 pin female / 9 pin
female
9540/BAN
4-wire test cable set with Banana Plugs
9541A
4-wire test cable set with Kelvin clips
(Ag coating)
9542A
Universal test adapter
31 VA
According to CE-regulation 89/336: Emmission according to EN 55011, Group 1 Class B,
respectively CISPR 11. Immunity according to EN 50082 - 1, inclusive IEC 801-2,-3,-4.
According to CE-regulation 73/23 EN61010 CAT II, Pollution Degree 2, CSA C22.2 No. 231
30 minutes
Options (for 1J4265)
9541B
4-wire test cable set with Kelvin clips
(Heavy Au gold 2-4um)
0°C to 50°C
–40°C to 70°C
100/120/220/240 V ± 10%
50/60 Hz
44 VA
1J4265
Automatic LCR Meter DC-100 kHz
Supplied with User Manual and AC
Power cable
9540/TWE
SMD tweezers
Via RS-232 interface for serial printers
Environmental conditions
Operating temperature
Storage temperature
Power requirements
Line frequency
Power consumption
Vmax. < 500 V - 0.234
Vmax. < 117 x (C/mF)
(Vmax. in V, C in mF)
Vmax. < 100 V
9+1 (trim figures included)
9+1
Calibration
Calibration interval
1J4260
Automatic LCR Meter 1 kHz
Supplied with User Manual and AC
Power cable
/B IEEE-488 Interface (supplied in place
of RS-232 interface)
/C DC Test
/D Handler Interface
Open circuit compensation Z > 100 kΩ
Short circuit compensation Z < 10 Ω
Vmax. < 200 V -0.234
Vmax. < 47 x (C/mF)
(Vmax. in V, C in mF)
Vmax. < 40 V
Description
Options (for 1J4270)
9
Bin “O” and bin “fail”
IEEE-488 interface
RS-232 interface
Bin programmer (4265 only)
Absolute or relative
Bin limit programming
Trim function
Open circuit
Short circuit
200 Hz to 20 kHz (200 Hz steps)
100 kHz
DC (optional)
ORDERING CODES/OPTIONS
5 minutes
315 x 105 x 405mm (12.4” x 4.13” x 15.9”)
5.3 kg /11.7 lb
4.7 kg /10.4 lb
9542SMD
Test fixture for SMD’s. (Used in
conjunction with the 9542A)
9564
Rack mount kit
USA
UK
ASIA
Wayne Kerr Inc
165L New Boston Street
Woburn MA 01801-1744
Durban Road Bognor Regis
West Sussex PO22 9RL
14F-6, No. 79 Hsin Tai Wu Rd, Sec1
Hsi-Chih, Taipei 221
Taiwan R.O.C.
Tel: 781 938 8390
Fax: 781 933 9523
Sales: (800) 933 9319
Tel: + 44 1243 825811
Fax: + 44 1243 824698
email: sales@wayne-kerr.co.uk
www.waynekerrtest.com
email: sales@waynekerr.com
www.waynekerrtest.com
Distributors worldwide contact UK office
Tel: + 886 2 2698 4104
Fax: + 886 2 2698 0716
email: wksales@microtest.com.tw
www.waynekerrtest.com