CERTIFICATE
Issued Date: Aug. 03, 2011
Report No. : 117394R-ITCEP07V06
This is to certify that the following designated product
Product
: Personal Computer
Trade name
: msi
Model Number : MS-B025
Company Name : MICRO-STAR INT'L Co., LTD.
This product, which has been issued the test report listed as above in QuieTek
Laboratory, is based on a single evaluation of one sample and confirmed to
comply with the requirements of the following EMC standard.
EN 55022:2006+A1: 2007, Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006+A2: 2009
IEC 61000-4-2: 2008
EN 61000-3-3:2008
IEC 61000-4-3: 2010
IEC 61000-4-4: 2011
IEC 61000-4-5: 2005
IEC 61000-4-6: 2008
IEC 61000-4-8: 2009
IEC 61000-4-11: 2004
TEST LABORATORY
Vincent Lin / Manager
No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C.
TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quietek.com
http://www.quietek.com
Test Report
Product Name : Personal Computer
Model No.
: MS-B025
Applicant : MICRO-STAR INT’L Co., LTD.
Address : No. 69, Li-De St., Jung-He District, New Taipei City, Taiwan
Date of Receipt : 2011/07/25
Issued Date
: 2011/08/03
Report No.
: 117394R-ITCEP07V06
Report Version : V1.0
The test results relate only to the samples tested.
The test results shown in the test report are traceable to the national/international standard through the calibration
of the equipment and evaluated measurement uncertainty herein.
This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity
We herewith confirm the following designated products to comply with the
requirements set out in the Council Directive on the approximation of the laws of
the Member States relating to Electromagnetic Compatibility Directive
(2004/108/EC) with applicable standards listed below.
Product
: Personal Computer
Trade name
: msi
Model Number
: MS-B025
Applicable Harmonized
: EN 55022: 2006+A1: 2007, Class B
Standards under Directive
EN 55024: 1998+A1: 2001+A2: 2003
2004/108/EC
EN 61000-3-2:2006+A2: 2009
EN 61000-3-3:2008
Company Name
:
Company Address :
Telephone
:
Facsimile :
Person in responsible for marking this declaration:
Name (Full Name)
Title/ Department
Date
Legal Signature
Accredited by NVLAP, TAF-CNLA, DNV, TUV, Nemko
Date: Aug. 03, 2011
QTK No.: 117394R-ITCEP07V06
Statement of Conformity
This statement is to certify that the designated product below.
Product
Trade name
: Personal Computer
: msi
: MS-B025
Model Number
Company Name
: MICRO-STAR INT'L Co., LTD.
Applicable Standards : EN 55022: 2006+A1: 2007, Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006+A2: 2009
EN 61000-3-3:2008
One sample of the designated product has been tested and evaluated in our
laboratory to find in compliance with the applicable standards above. The issued
test report(s) show(s) it in detail.
Report Number
:
117394R-ITCEP07V06
TEST LABORATORY
Vincent Lin / Manager
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
Quietek Corporation / No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C.
Tel: 866-2-8601-3788, Fax: +886-2-8601-3789, E-mail: service@quietek.com
Report No:117394R-ITCEP07V06
Tes t R e p o r t C e r t i f i c a t i o n
Issued Date
Report No.
: 2011/08/03
: 117394R-ITCEP07V06
Product Name
:
Personal Computer
Applicant
:
MICRO-STAR INT’L Co., LTD.
Address
:
No. 69, Li-De St., Jung-He District, New Taipei City, Taiwan
Manufacturer
:
MICRO-STAR INT’L Co., LTD.
Model No.
:
MS-B025
EUT Rated Voltage
:
AC 100-240V, 50-60Hz
EUT Test Voltage
:
AC 230 V / 50 Hz
Trade Name
:
msi
Applicable Standard
:
EN 55022: 2006+A1: 2007, Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006+A2: 2009
EN 61000-3-3:2008
Test Result
:
Complied
Performed Location
:
Quietek Corporation (Linkou Laboratory)
No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451,
Taiwan, R.O.C.
TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
Documented By
:
(Adm.Assistant / Anny Chou)
Reviewed By
:
Engineer / Harrison Chen )
Approved By
:
( Manager / Vincent Lin )
Page: 2 of 90
Report No:117394R-ITCEP07V06
Laboratory Information
We, QuieTek Corporation, are an independent EMC and safety consultancy that was
established the whole facility in our laboratories. The test facility has been accredited/accepted
(audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and
specified testing scopes:
Taiwan R.O.C.
:
BSMI, NCC, TAF
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded
from QuieTek Corporation’s Web Site : http://www.quietek.com/tw/ctg/cts/accreditations.htm
The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site :
http://www.quietek.com/
If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C.
TEL:+886-3-592-8858 / FAX:+886-3-592-8859
E-Mail : service@quietek.com
LinKou Testing Laboratory :
No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
Suzhou (China) Testing Laboratory :
No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.
TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098
E-Mail : service@quietek.com
Page: 3 of 90
Report No:117394R-ITCEP07V06
TABLE OF CONTENTS
Description
Page
1. General Information .................................................................................................... 7
1.1. EUT Description ...................................................................................................... 7
1.2. Mode of Operation .................................................................................................. 9
1.3. Tested System Details............................................................................................. 9
1.4. Configuration of Tested System ............................................................................ 13
1.5. EUT Exercise Software ......................................................................................... 14
2. Technical Test ........................................................................................................... 15
2.1. Summary of Test Result ........................................................................................ 15
2.2. List of Test Equipment ........................................................................................... 16
2.3. Measurement Uncertainty ..................................................................................... 18
2.4. Test Environment .................................................................................................. 20
3. Conducted Emission (Main Terminals)...................................................................... 21
3.1. Test Specification .................................................................................................. 21
3.2. Test Setup ............................................................................................................. 21
3.3. Limit....................................................................................................................... 21
3.4. Test Procedure ...................................................................................................... 22
3.5. Deviation from Test Standard ................................................................................ 22
3.6. Test Result ............................................................................................................ 23
3.7. Test Photograph .................................................................................................... 29
4. Conducted Emissions (Telecommunication Ports).................................................... 30
4.1. Test Specification .................................................................................................. 30
4.2. Test Setup ............................................................................................................. 30
4.3. Limit....................................................................................................................... 30
4.4. Test Procedure ...................................................................................................... 31
4.5. Deviation from Test Standard ................................................................................ 31
4.6. Test Result ............................................................................................................ 32
4.7. Test Photograph .................................................................................................... 41
5. Radiated Emission.................................................................................................... 42
5.1. Test Specification .................................................................................................. 42
5.2. Test Setup ............................................................................................................. 42
5.3. Limit....................................................................................................................... 43
5.4. Test Procedure ...................................................................................................... 44
5.5. Deviation from Test Standard ................................................................................ 44
5.6. Test Result ............................................................................................................ 45
5.7. Test Photograph .................................................................................................... 49
6. Harmonic Current Emission ...................................................................................... 51
Page: 4 of 90
Report No:117394R-ITCEP07V06
6.1. Test Specification .................................................................................................. 51
6.2. Test Setup ............................................................................................................. 51
6.3. Limit....................................................................................................................... 51
6.4. Test Procedure ...................................................................................................... 53
6.5. Deviation from Test Standard ................................................................................ 53
6.6. Test Result ............................................................................................................ 54
6.7. Test Photograph .................................................................................................... 56
7. Voltage Fluctuation and Flicker ................................................................................. 57
7.1. Test Specification .................................................................................................. 57
7.2. Test Setup ............................................................................................................. 57
7.3. Limit....................................................................................................................... 57
7.4. Test Procedure ...................................................................................................... 58
7.5. Deviation from Test Standard ................................................................................ 58
7.6. Test Result ............................................................................................................ 59
7.7. Test Photograph .................................................................................................... 60
8. Electrostatic Discharge ............................................................................................. 61
8.1. Test Specification .................................................................................................. 61
8.2. Test Setup ............................................................................................................. 61
8.3. Limit....................................................................................................................... 61
8.4. Test Procedure ...................................................................................................... 62
8.5. Deviation from Test Standard ................................................................................ 62
8.6. Test Result ............................................................................................................ 63
8.7. Test Photograph .................................................................................................... 64
9. Radiated Susceptibility ............................................................................................. 65
9.1. Test Specification .................................................................................................. 65
9.2. Test Setup ............................................................................................................. 65
9.3. Limit....................................................................................................................... 65
9.4. Test Procedure ...................................................................................................... 66
9.5. Deviation from Test Standard ................................................................................ 66
9.6. Test Result ............................................................................................................ 67
9.7. Test Photograph .................................................................................................... 68
10.
Electrical Fast Transient/Burst............................................................................... 69
10.1.
Test Specification ............................................................................................... 69
10.2.
Test Setup.......................................................................................................... 69
10.3.
Limit ................................................................................................................... 69
10.4.
Test Procedure .................................................................................................. 70
10.5.
Deviation from Test Standard............................................................................. 70
10.6.
Test Result......................................................................................................... 71
Page: 5 of 90
Report No:117394R-ITCEP07V06
10.7.
Test Photograph ................................................................................................ 72
11.
Surge..................................................................................................................... 73
11.1.
Test Specification ............................................................................................... 73
11.2.
Test Setup.......................................................................................................... 73
11.3.
Limit ................................................................................................................... 73
11.4.
Test Procedure .................................................................................................. 73
11.5.
Deviation from Test Standard............................................................................. 74
11.6.
Test Result......................................................................................................... 75
11.7.
Test Photograph ................................................................................................ 76
12.
Conducted Susceptibility ....................................................................................... 77
12.1.
Test Specification ............................................................................................... 77
12.2.
Test Setup.......................................................................................................... 77
12.3.
Limit ................................................................................................................... 78
12.4.
Test Procedure .................................................................................................. 78
12.5.
Deviation from Test Standard............................................................................. 78
12.6.
Test Result......................................................................................................... 79
12.7.
Test Photograph ................................................................................................ 80
13.
Power Frequency Magnetic Field .......................................................................... 81
13.1.
Test Specification ............................................................................................... 81
13.2.
Test Setup.......................................................................................................... 81
13.3.
Limit ................................................................................................................... 81
13.4.
Test Procedure .................................................................................................. 81
13.5.
Deviation from Test Standard............................................................................. 81
13.6.
Test Result......................................................................................................... 82
13.7.
Test Photograph ................................................................................................ 83
14.
Voltage Dips and Interruption ................................................................................ 84
14.1.
Test Specification ............................................................................................... 84
14.2.
Test Setup.......................................................................................................... 84
14.3.
Limit ................................................................................................................... 84
14.4.
Test Procedure .................................................................................................. 85
14.5.
Deviation from Test Standard............................................................................. 85
14.6.
Test Result......................................................................................................... 86
14.7.
Test Photograph ................................................................................................ 87
15.
Attachment ............................................................................................................ 88
EUT Photograph.................................................................................................... 88
Page: 6 of 90
Report No:117394R-ITCEP07V06
1. General Information
1.1. EUT Description
Product Name Personal Computer
Trade Name
msi
Model No.
MS-B025
Page: 7 of 90
Report No:117394R-ITCEP07V06
Keyparts List
Item
Vendor
Model Name
Motherboard
MSI
MS-7744
CPU
Core i3
core i5
Pentium
Intel
I3-2100,INTEL/CM8062301061600(SR05C),3.1GHz,LGA-1155pin
Intel
I3-2120,INTEL/CM8062301044204(SR05Y),3.3GHz,LGA-1155pin
Intel
I3-2105,INTEL/CM8062301090600(QAHQ),3.1GHz,LGA-1155pin
Intel
I5-2400S,INTEL/CM8062300835404(SR00S),2.5GHz,LGA-1155pin
Intel
I5-2500, INTEL/CM8062300834106(SR00Q ),3.3GHz,LGA-1155pin
Intel
I5-2310,INTEL/CM8062301043700(Q1MM),2.9GHz,LGA-1155pin
Intel
DUAL CORE G620,INTEL/CM8062301046304(SR05R),2.6GHz,FCLGA-1155pin
Intel
G840,INTEL/CM8062301046104(Q1FU),2.8GHz,LGA-1155pin
Intel
G850,INTEL/CM8062301046204(Q1FW),2.9GHz,LGA-1155pin
Intel
G620T,INTEL/CM8062301046504(Q1G2),2.2GHz,LGA-1155pin
WD
3.5inch,160GB,7200RPM,WESTERN DIGITAL/WD1600AAJS
WD
3.5 inch,320GB,7200RPM,WESTERN DIGITAL/WD3200AAJS
WD
3.5 inch,320GB,7200RPM,WESTERN DIGITAL/WD3200AAKX
WD
3.5 inch,500GB,7200RPM,WESTERN DIGITAL/WD5000AAKX
Seagate
3.5 inch,500GB,7200RPM,SEAGATE/ST3500413AS
WD
3.5 inch,640GB,7200RPM,WESTERN DIGITAL/WD6400AAKS
WD
3.5 inch,1TB,5400RPM+,WESTERN DIGITAL/WD10EARS
WD
3.5 inch,1TB,7200RPM,WESTERN DIGITAL/WD10EALX
Seagate
3.5 inch,1TB,7200RPM,SEAGATE/ST31000524AS
WD
3.5 inch,1.5TB,5400RPM+,WESTERN DIGITAL/WD15EARS
WD
3.5 inch,1.5TB,5400RPM+,WESTERN DIGITAL/WD15EARX
Seagate
3.5 inch,1.5TB,5900RPM,SEAGATE/ST1500DL001
WD
3.5 inch,2TB,5400RPM+,WESTERN DIGITAL/WD20EARS
WD
3.5 inch,2TB,5400RPM+,WESTERN DIGITAL/WD20EARX
3.5" HDD
160GB
320GB
500G
640G
1TB
1.5TB
2TB
DDR3 Long DIMM
4G
DDR3 SDRAM,4GB,667(1333)MHz
5.25'' ODD
SUPER MULTI PLDS
DH-24ABS-02
Page: 8 of 90
Report No:117394R-ITCEP07V06
1.2. Mode of Operation
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1
Mode 5
Mode 9
Mode 13
Mode 2
Mode 6
Mode 10
Mode 14
Mode 3
Mode 7
Mode 11
Mode 15
Mode 4
Mode 8
Mode 12
Mode 16
Final Test Mode
Emission
Mode 1
ITEM
Display
MB
CPU
HDD
ODD
POWER
ITEM
Display
MB
CPU
HDD
ODD
POWER
ITEM
Display
MB
CPU
HDD
ODD
POWER
Mode 1
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
WESTERN DIGITAL
WD5000AAKX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 2
DVI+D-SUB 1920*1200/60Hz
MSI/MS-7744
INTEL/I3-2100,3.1GHz
WESTERN DIGITAL
WD1600AAJS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 3
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I3-2120,3.3GHz
WESTERN DIGITAL
WD3200AAJS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 4
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I3-2105,3.1GHz
WESTERN DIGITAL
WD3200AAKX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 5
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2400S,2.5GHz
WESTERN DIGITAL
WD5000AAKX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 6
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2310,2.9GHz
SEAGATE
ST3500413AS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
INTEL/I5-2500,3.3GHz
Page: 9 of 90
Report No:117394R-ITCEP07V06
ITEM
Display
MB
CPU
HDD
ODD
POWER
ITEM
Display
MB
CPU
HDD
ODD
POWER
ITEM
Display
MB
CPU
HDD
ODD
POWER
ITEM
Display
MB
CPU
HDD
ODD
POWER
Mode 7
DVI+D-SUB 1920*1200/60Hz
MSI/MS-7744
WESTERN DIGITAL
WD6400AAKS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 8
DVI+D-SUB 1920*1200/60Hz
MSI/MS-7744
INTEL/G840,2.8GHz
WESTERN DIGITAL
WD10EARS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 9
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/G850,2.9GHz
WESTERN DIGITAL
WD10EALX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 10
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/G620T,2.2GHz
WESTERN DIGITAL
WD10EALX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode 11
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2500,3.3GHz
SEAGATE
ST31000524AS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Mode12
DVI+D-SUB 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2500,3.3GHz
WESTERN DIGITAL
Mode 13
DVI+D-SUB I 1920*1200/60Hz
MSI/MS-7744
Mode 14
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2500,3.3GHz
SEAGATE
ST1500DL001
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
INTEL/G620,2.6GHz
INTEL/I5-2500,3.3GHz
WESTERN DIGITAL
WD15EARX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Page: 10 of 90
WD15EARS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Report No:117394R-ITCEP07V06
ITEM
Display
MB
CPU
HDD
ODD
POWER
Mode 15
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2500,3.3GHz
WESTERN DIGITAL
WD20EARS
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Page: 11 of 90
Mode 16
DVI+HDMI 1920*1200/60Hz
MSI/MS-7744
INTEL/I5-2500,3.3GHz
WESTERN DIGITAL
WD20EARX
PLDS/DH-24ABS-02
FSP/FSP270-60MSP
DDR3 Long DIMM 1G,2G,4G
Report No:117394R-ITCEP07V06
1.3. Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system (including
inserted cards) are:
Product
Manufacturer Model No.
Serial No.
Power Cord
Monitor (EMI)
DELL
U2410
CN-0J257M-728-01I-04PL
Non-Shielded, 1.8m
Monitor (EMS)
LG
W2261VT
907YHPB07296
Non-Shielded, 1.8m
2
USB 3.0
BUFFALO
HD-H1.0TU3
15476991119601
N/A
3
USB 3.0
BUFFALO
HD-H1.0TU3
15476991119984
N/A
4
SATA HDD
Onnto
ST-M10
A01926-F03-0006
N/A
Monitor (EMI)
Dell
2407WFPb
CN-0FC255-46633-638-1MDS Non-Shielded, 1.8m
Monitor (EMS)
LG
W2261VT
907YHZK07303
Non-Shielded, 1.8m
6
Modem
ACEEX
DM-1414
0102027550
N/A
7
Modem
ACEEX
DM-1414
0102027554
N/A
IPod nano (EMI)
Apple
A1236
YM823SUQY0P
N/A
IPod nano (EMS) Apple
A1199
YM708A72VQ5
N/A
& Ergotech
ET-E201
N/A
N/A
& Ergotech
ET-E201
N/A
N/A
Apple
A1236
YM823SWVY0P
N/A
IPod nano (EMS) Apple
A1199
YM706LSCVQ5
N/A
Apple
A1236
7K823E51Y0P
N/A
IPod nano (EMS) Apple
A1199
YM7088TVVQ5
N/A
Apple
A1236
7L8221XGY0P
N/A
IPod nano (EMS) Apple
A1199
5U7047U8VQ5
N/A
Apple
A1236
7L8221YEY0P
N/A
IPod nano (EMS) Apple
A1199
YM709RBUVQ5
N/A
1
5
8
9
Microphone
Earphone
10
11
12
13
14
Microphone
Earphone
IPod nano (EMI)
IPod nano (EMI)
IPod nano (EMI)
IPod nano (EMI)
15 Keyboard
Logitech
Y-SAL85
SY917UK
N/A
16 Mouse
Logitech
M-SBM96B
810-000440
N/A
17 Notebook PC
DELL
D630
00144-023-351-283
Non-Shielded, 1.8m
Page: 12 of 90
Report No:117394R-ITCEP07V06
1.4.
Configuration of Tested System
Connection Diagram
Signal Cable Type
Signal cable Description
A
D-SUB Cable
Shielded, 1.8m with two ferrite cores bonded
B
HDMI Cable
Shielded, 1.6m
C
RS-232 Cable
Shielded, 1.6m, two PCS
D
Audio Cable
Non-Shielded, 1.6m
E
Earphone & Microphone Cable
Non-Shielded, 1.6m, two PCS
F
USB Cable
Shielded, 1.2m, four PCS
G
USB 3.0 Cable
Shielded, 1.0m, two PCS
H
SATA Cable
Shielded, 1.2m
I
DVI Cable
Shielded, 1.8m with two ferrite cores bonded
J
LAN Cable
Non-Shielded, 3.0m
K
Keyboard Cable
Shielded, 1.8m
L
Mouse Cable
Shielded, 1.8m
Page: 13 of 90
Report No:117394R-ITCEP07V06
1.5. EUT Exercise Software
1
Setup the EUT and simulators as shown on 1.4.
2
Turn on the power of all equipment.
3
Personal Computer reads data from disk.
4
Personal Computer sends “H” pattern to monitor.
5
Connect LAN to Personal Computer for transmitting data.
6
Run Windows Media Player program and play a disk with color Bar pattern.
7
Repeat the above procedure (4) to (6).
Page: 14 of 90
Report No:117394R-ITCEP07V06
2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards
Deviations from the test standards as below description:
Emission
Test
Performed Item
Normative References
Conducted Emission
EN 55022: 2006+A1: 2007
Yes
No
Impedance Stabilization Network
EN 55022: 2006+A1: 2007
Yes
No
Radiated Emission
EN 55022: 2006+A1: 2007
Yes
No
Power Harmonics
EN 61000-3-2:2006+A2: 2009
Yes
No
Voltage Fluctuation and Flicker
EN 61000-3-3:2008
Yes
No
Performed
Deviation
Immunity
Test
Performed Item
Normative References
Electrostatic Discharge
IEC 61000-4-2: 2008
Yes
No
Radiated susceptibility
IEC 61000-4-3: 2010
Yes
No
Electrical fast transient/burst
IEC 61000-4-4: 2011
Yes
No
Surge
IEC 61000-4-5: 2005
Yes
No
Conducted susceptibility
IEC 61000-4-6: 2008
Yes
No
Power frequency magnetic field
IEC 61000-4-8: 2009
Yes
No
Voltage dips and interruption
IEC 61000-4-11: 2004
Yes
No
Page: 15 of 90
Performed
Deviation
Report No:117394R-ITCEP07V06
2.2. List of Test Equipment
Conducted Emission / SR1
Instrument
EMI Test Receiver
LISN
LISN
Pulse Limiter
Manufacturer
R&S
R&S
R&S
R&S
Type No.
ESCS 30
ENV4200
ENV216
ESH3-Z2
Serial No
100366
833209/007
100085
357.88.10.52
Cal. Date
2010/11/10
2010/09/06
2011/02/10
2010/09/02
Type No.
CVP2200A
ESCS 30
ENV216
ENV4200
ESH3-Z2
F-65 10KHz~1GHz
FCC-TLISN-T2-02
FCC-TLISN-T4-02
FCC-TLISN-T8-02
Serial No
18331
100366
100085
833209/007
357.88.10.52
198
20316
20317
20319
Cal. Date
2010/11/15
2010/11/10
2011/02/10
2010/09/06
2010/09/02
2010/11/08
2011/07/08
2011/07/08
2011/07/08
Type No.
CBL6112B
ESCS 30
N/A
N9000A
Serial No
2918
100121
N/A
MY50510072
Cal. Date
2011/07/28
2010/12/06
2011/07/07
2011/02/10
Type No.
ESIB26
9120D
AP-180C
Serial No
838786/004
576
CHM/071920
Cal. Date
2011/06/29
2010/11/12
2010/08/04
Manufacturer
Type No.
Serial No
Cal. Date
Schaffner
NSG 1007
HK54148
2010/09/06
Schaffner
CCN 1000-1
X7 1887
2010/09/06
Type No.
Serial No
Cal. Date
NSG 1007
HK54148
2010/09/06
CCN 1000-1
X7 1887
2010/09/06
Impedance Stabilization Network / SR1
Instrument
Manufacturer
Capacitive Voltage Probe
Schaffner
EMI Test Receiver
R&S
LISN
R&S
LISN
R&S
Pulse Limiter
R&S
RF Current Probe
FCC
BALANCED TELECOM ISN FCC
BALANCED TELECOM ISN FCC
BALANCED TELECOM ISN FCC
Radiated Emission / Site1
Instrument
Bilog Antenna
EMI Test Receiver
Pre-Amplifier
CXA Signal Analyzer
Manufacturer
Schaffner Chase
R&S
QTK
Agilent
Radiated Emission / 9x6x6_Chamber
Instrument
Manufacturer
EMI Test Receiver
R&S
Horn Antenna
Schwarzbeck
Pre-Amplifier
QuieTek
Power Harmonics / SR3
Instrument
AC Power
Source(Harmonic)
IEC1000-4-X
Analyzer(Flicker)
Voltage Fluctuation and Flicker / SR3
Instrument
Manufacturer
AC Power
Schaffner
Source(Harmonic)
IEC1000-4-X
Schaffner
Analyzer(Flicker)
Page: 16 of 90
Report No:117394R-ITCEP07V06
Electrostatic Discharge / SR6
Instrument
Manufacturer
ESD Simulator System
Noiseken
Horizontal Coupling
QuieTek
Plane(HCP)
Vertical Coupling
QuieTek
Plane(VCP)
Type No.
TC-815R
Serial No
ESS09Z9758
Cal. Date
2011/03/28
HCP AL50
N/A
N/A
VCP AL50
N/A
N/A
Type No.
AF-BOX
ACCUST
UPL 16
3149
DC 6180
5935
4227
30S1G3
100W10000M7
CBA9413B
75A250A
NRVD(P.M)
150A220
4182
SMT03
Serial No
Cal. Date
100007
N/A
100137
00071675
22735
2426784
2439692
309453
A285000010
4020
0325371
100219
23067
2278070
100170
2011/05/09
N/A
N/A
2011/04/21
2011/04/21
N/A
N/A
N/A
N/A
2011/05/09
N/A
2011/04/21
2011/05/09
Electrical fast transient/burst / SR6
Instrument
Manufacturer
TRANSIENT TEST
EMC PARTNER
SYSTEM
Type No.
TRA2000IN6
Serial No
1138
Cal. Date
2010/12/09
Surge / SR6
Instrument
TRANSIENT TEST
SYSTEM
Type No.
TRA2000IN6
Serial No
1138
Cal. Date
2010/12/09
Type No.
Serial No
Cal. Date
N/A
N/A
2011/04/07
Type No.
INA 2141
INA 702
Serial No
6002
160
Cal. Date
N/A
N/A
Type No.
TRA2000IN6
Serial No
1138
Cal. Date
2010/12/09
Radiated susceptibility / CB5
Instrument
Manufacturer
AF-BOX
R&S
Audio Analyzer
Biconilog Antenna
Directional Coupler
Dual Microphone Supply
Mouth Simulator
Power Amplifier
Power Amplifier
Power Amplifier
Power Amplifier
Power Meter
Pre-Amplifier
Probe Microphone
Signal Generator
R&S
EMCO
A&R
B&K
B&K
A&R
A&R
SCHAFFNER
AR
R&S
A&R
B&K
R&S
Manufacturer
EMC PARTNER
Conducted susceptibility / SR6
Instrument
Manufacturer
Schaffner NSG 2070
Schaffner
RF-Generator
Power frequency magnetic field / SR3
Instrument
Manufacturer
Induction Coil Interface
Schaffner
Magnetic Loop Coil
Schaffner
Voltage dips and interruption / SR6
Instrument
Manufacturer
TRANSIENT TEST
EMC PARTNER
SYSTEM
Page: 17 of 90
Report No:117394R-ITCEP07V06
2.3. Measurement Uncertainty
Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Impedance Stabilization Network
The measurement uncertainty is evaluated as ± 2.26 dB.
Radiated Emission
The measurement uncertainty is evaluated as ± 3.19 dB.
Electrostatic Discharge
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in ESD testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant ESD standards. The
immunity test signal from the ESD system meet the required specifications in IEC
61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 3.0 % and 3.8%.
Radiated susceptibility
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in RS testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant RS standards. The
immunity test signal from the RS system meet the required specifications in IEC 61000-4-3
through the calibration for the uniform field strength and monitoring for the test level with the
uncertainty evaluation report for the electrical filed strength as being 3.57 dB.
Electrical fast transient/burst
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in EFT/Burst testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards.
The immunity test signal from the EFT/Burst system meet the required specifications in IEC
61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of
voltage, frequency and timing as being 4 %, and 2.5%.
Surge
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in Surge testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant Surge standards. The
immunity test signal from the Surge system meet the required specifications in IEC
61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 3.5 % and 0.1%.
Page: 18 of 90
Report No:117394R-ITCEP07V06
Conducted susceptibility
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in CS testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant CS standards. The
immunity test signal from the CS system meet the required specifications in IEC 61000-4-6
through the calibration for unmodulated signal and monitoring for the test level with the
uncertainty evaluation report for the injected modulated signal level through CDN and EM
Clamp/Direct Injection as being 2.0 dB and 2.61 dB.
Power frequency magnetic field
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in PFM testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant PFM standards. The
immunity test signal from the PFM system meet the required specifications in IEC
61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter
to verify the output level of magnetic field strength as being 2.0 %.
Voltage dips and interruption
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025, the
requirements for measurement uncertainty in DIP testing are deemed to have been
satisfied, and the testing is reported in accordance with the relevant DIP standards. The
immunity test signal from the DIP system meet the required specifications in IEC
61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 3.5 % and 0.1%.
Page: 19 of 90
Report No:117394R-ITCEP07V06
2.4. Test Environment
Performed Item
Conducted Emission
Impedance Stabilization Network
Radiated Emission
Electrostatic Discharge
Radiated susceptibility
Electrical fast transient/burst
Surge
Conducted susceptibility
Power frequency magnetic field
Voltage dips and interruption
Items
Required
Actual
Temperature (C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
30-60
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
10-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Page: 20 of 90
Report No:117394R-ITCEP07V06
3. Conducted Emission (Main Terminals)
3.1. Test Specification
According to EMC Standard : EN 55022
3.2. Test Setup
3.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
66 - 56
56 – 46
0.50-5.0
56
46
5.0 - 30
60
50
Remarks: In the above table, the tighter limit applies at the band edges.
Page: 21 of 90
Report No:117394R-ITCEP07V06
3.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through
a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must
be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using
a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard
No deviation.
Page: 22 of 90
Report No:117394R-ITCEP07V06
3.6. Test Result
Site : SR_1
Time : 2011/07/26 - 23:14
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Personal Computer
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
Page: 23 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:15
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Personal Computer
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.150
9.790
40.090
49.880
-16.120
66.000
QUASIPEAK
2
0.216
9.790
31.220
41.010
-23.104
64.114
QUASIPEAK
3
0.439
9.790
25.430
35.220
-22.523
57.743
QUASIPEAK
4
0.724
9.798
24.710
34.508
-21.492
56.000
QUASIPEAK
5
8.779
9.870
27.210
37.080
-22.920
60.000
QUASIPEAK
6
17.642
10.110
32.380
42.490
-17.510
60.000
QUASIPEAK
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 24 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:15
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Personal Computer
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.150
9.790
37.560
47.350
-8.650
56.000
AVERAGE
2
0.216
9.790
26.430
36.220
-17.894
54.114
AVERAGE
3
0.439
9.790
16.380
26.170
-21.573
47.743
AVERAGE
4
0.724
9.798
22.260
32.058
-13.942
46.000
AVERAGE
5
8.779
9.870
22.190
32.060
-17.940
50.000
AVERAGE
6
17.642
10.110
18.390
28.500
-21.500
50.000
AVERAGE
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 25 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:16
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Personal Computer
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 1
Page: 26 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:17
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Personal Computer
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.150
9.783
41.720
51.503
-14.497
66.000
QUASIPEAK
2
0.361
9.790
29.360
39.150
-20.821
59.971
QUASIPEAK
3
0.724
9.790
28.770
38.560
-17.440
56.000
QUASIPEAK
4
2.466
9.800
28.470
38.270
-17.730
56.000
QUASIPEAK
5
9.869
9.900
27.420
37.320
-22.680
60.000
QUASIPEAK
17.564
10.200
35.690
45.890
-14.110
60.000
QUASIPEAK
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 27 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:17
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Personal Computer
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.150
9.783
38.370
48.153
-7.847
56.000
AVERAGE
2
0.361
9.790
25.390
35.180
-14.791
49.971
AVERAGE
3
0.724
9.790
27.570
37.360
-8.640
46.000
AVERAGE
4
2.466
9.800
26.830
36.630
-9.370
46.000
AVERAGE
5
9.869
9.900
23.450
33.350
-16.650
50.000
AVERAGE
6
17.564
10.200
21.450
31.650
-18.350
50.000
AVERAGE
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 28 of 90
Report No:117394R-ITCEP07V06
3.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of Conducted Test
: Mode 1
: Back View of Conducted Test
Page: 29 of 90
Report No:117394R-ITCEP07V06
4. Conducted Emissions (Telecommunication Ports)
4.1. Test Specification
According to EMC Standard: EN 55022
4.2. Test Setup
4.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
84 – 74
74 – 64
0.50 - 30
74
64
Remarks:
The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50
MHz.
Page: 30 of 90
Report No:117394R-ITCEP07V06
4.4. Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement
of telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance.
Both alternative cables are tested related to the LCL requested. The measurement
range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.
The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable,
55dB LCL ISN is used for cat. 3.
4.5. Deviation from Test Standard
No deviation.
Page: 31 of 90
Report No:117394R-ITCEP07V06
4.6. Test Result
Site : SR_1
Time : 2011/07/26 - 23:24
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Personal Computer
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 10MB
Page: 32 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:25
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Personal Computer
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
4.947
9.980
37.900
47.880
-26.120
74.000
QUASIPEAK
2
5.923
9.980
37.500
47.480
-26.520
74.000
QUASIPEAK
7.502
9.970
50.340
60.310
-13.690
74.000
QUASIPEAK
4
9.994
9.960
40.540
50.500
-23.500
74.000
QUASIPEAK
5
11.197
9.964
42.160
52.124
-21.876
74.000
QUASIPEAK
6
13.752
10.143
43.640
53.783
-20.217
74.000
QUASIPEAK
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 33 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:25
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Personal Computer
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
4.947
9.980
27.270
37.250
-26.750
64.000
AVERAGE
2
5.923
9.980
27.720
37.700
-26.300
64.000
AVERAGE
7.502
9.970
38.720
48.690
-15.310
64.000
AVERAGE
4
9.994
9.960
28.430
38.390
-25.610
64.000
AVERAGE
5
11.197
9.964
31.620
41.584
-22.416
64.000
AVERAGE
6
13.752
10.143
30.950
41.093
-22.907
64.000
AVERAGE
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 34 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:21
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Personal Computer
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 100MB
Page: 35 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:22
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Personal Computer
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
7.923
9.970
43.960
53.930
-20.070
74.000
QUASIPEAK
2
10.060
9.960
43.680
53.640
-20.360
74.000
QUASIPEAK
3
13.420
10.150
46.780
56.930
-17.070
74.000
QUASIPEAK
4
16.228
10.130
48.540
58.670
-15.330
74.000
QUASIPEAK
5
18.244
10.120
50.240
60.360
-13.640
74.000
QUASIPEAK
23.127
10.100
51.210
61.310
-12.690
74.000
QUASIPEAK
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 36 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:22
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Personal Computer
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
7.923
9.970
41.000
50.970
-13.030
64.000
AVERAGE
2
10.060
9.960
40.720
50.680
-13.320
64.000
AVERAGE
3
13.420
10.150
44.390
54.540
-9.460
64.000
AVERAGE
4
16.228
10.130
45.880
56.010
-7.990
64.000
AVERAGE
5
18.244
10.120
47.540
57.660
-6.340
64.000
AVERAGE
23.127
10.100
48.500
58.600
-5.400
64.000
AVERAGE
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 37 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:18
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Personal Computer
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 1G
Page: 38 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:20
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Personal Computer
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.552
10.155
26.690
36.845
-37.155
74.000
QUASIPEAK
2
0.736
10.140
29.330
39.470
-34.530
74.000
QUASIPEAK
3
5.068
10.050
29.810
39.860
-34.140
74.000
QUASIPEAK
8.552
10.060
35.610
45.670
-28.330
74.000
QUASIPEAK
5
11.806
10.140
33.110
43.250
-30.750
74.000
QUASIPEAK
6
24.162
10.200
32.700
42.900
-31.100
74.000
QUASIPEAK
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 39 of 90
Report No:117394R-ITCEP07V06
Site : SR_1
Time : 2011/07/26 - 23:20
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Personal Computer
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.552
10.155
21.390
31.545
-32.455
64.000
AVERAGE
2
0.736
10.140
23.100
33.240
-30.760
64.000
AVERAGE
3
5.068
10.050
24.770
34.820
-29.180
64.000
AVERAGE
8.552
10.060
30.120
40.180
-23.820
64.000
AVERAGE
5
11.806
10.140
27.910
38.050
-25.950
64.000
AVERAGE
6
24.162
10.200
27.490
37.690
-26.310
64.000
AVERAGE
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 40 of 90
Report No:117394R-ITCEP07V06
4.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of ISN Test
: Mode 1
: Back View of ISN Test
Page: 41 of 90
Report No:117394R-ITCEP07V06
5. Radiated Emission
5.1. Test Specification
According to EMC Standard : EN 55022
5.2. Test Setup
Under 1GHz Test Setup:
Above 1GHz Test Setup:
Page: 42 of 90
Report No:117394R-ITCEP07V06
5.3. Limit
Limits
Frequency
Distance (m)
dBuV/m
30 – 230
10
30
230 – 1000
10
37
(MHz)
Limits
Frequency
Distance
Peak
Average
(GHz)
(m)
(dBuV/m)
(dBuV/m)
1–3
3
70
50
3–6
3
74
54
Remark:
1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring instrument
antenna and the closed point of any part of the device or system.
Highest frequency generated or used
in the device or on which the device
Upper frequency of measurement
range (MHz)
operates or tunes (MHz)
Below 108
1000
108 – 500
2000
500 – 1000
5000
Above 1000
5th harmonic of the highest frequency
or 6 GHz, whichever is lower
Page: 43 of 90
Report No:117394R-ITCEP07V06
5.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The
turn table can rotate 360 degrees to determine the position of the maximum emission level.
The EUT was positioned such that the distance from antenna to the EUT was 3/10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to
find the maximum emission, all of the interface cables must be manipulated on radiated
measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz and above 1GHz using a receiver bandwidth of 1MHz.
30MHz to1GHz Radiated was performed at an antenna to EUT distance of 10 meters.
Above1GHz Radiated was performed at an antenna to EUT distance of 3 meters.
It is placed with absorb on the ground between EUT and Antenna.
5.5. Deviation from Test Standard
No deviation.
Page: 44 of 90
Report No:117394R-ITCEP07V06
5.6. Test Result
Site : OATS-1
Time : 2011/07/28 - 03:48
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Personal Computer
Probe : Site1_CBL6112_10M_0811 - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
139.050
12.875
11.858
24.733
-5.267
30.000
QUASIPEAK
2
148.420
12.123
13.250
25.373
-4.627
30.000
QUASIPEAK
3
154.500
11.692
14.223
25.915
-4.085
30.000
QUASIPEAK
4
216.000
10.572
15.241
25.813
-4.187
30.000
QUASIPEAK
5
240.000
13.300
16.610
29.910
-7.090
37.000
QUASIPEAK
6
250.000
14.388
14.760
29.148
-7.852
37.000
QUASIPEAK
7
309.990
16.098
8.721
24.819
-12.181
37.000
QUASIPEAK
8
463.490
20.282
10.887
31.169
-5.831
37.000
QUASIPEAK
617.990
22.739
14.231
36.970
-0.030
37.000
QUASIPEAK
10
772.500
24.400
9.965
34.365
-2.635
37.000
QUASIPEAK
11
865.180
25.151
3.829
28.980
-8.020
37.000
QUASIPEAK
12
926.980
25.626
10.638
36.264
-0.736
37.000
QUASIPEAK
9
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 45 of 90
Report No:117394R-ITCEP07V06
Site : OATS-1
Time : 2011/07/28 - 03:45
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Personal Computer
Probe : Site1_CBL6112_10M_0811 - VERTICAL
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
69.240
6.729
16.313
23.042
-6.958
30.000
QUASIPEAK
2
117.080
13.180
15.003
28.183
-1.817
30.000
QUASIPEAK
148.600
12.110
17.549
29.659
-0.341
30.000
QUASIPEAK
4
169.940
11.204
10.748
21.952
-8.048
30.000
QUASIPEAK
5
216.000
10.572
15.541
26.113
-3.887
30.000
QUASIPEAK
6
240.000
13.300
16.510
29.810
-7.190
37.000
QUASIPEAK
7
250.000
14.388
12.660
27.048
-9.952
37.000
QUASIPEAK
8
617.990
22.739
8.231
30.970
-6.030
37.000
QUASIPEAK
9
772.500
24.400
7.565
31.965
-5.035
37.000
QUASIPEAK
10
865.180
25.151
5.029
30.180
-6.820
37.000
QUASIPEAK
11
926.980
25.626
10.938
36.564
-0.436
37.000
QUASIPEAK
3
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 46 of 90
Report No:117394R-ITCEP07V06
Site: CB7 (9x6x6_Chamber)
Time: 2011/07/26 - 17:42
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Horizontal
EUT : Personal Computer
Power : AC 230V/50Hz
Note : Mode 1
No
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1
1661.000
56.659
63.230
-13.341
2
1661.000
43.249
49.820
3
5000.000
54.862
5000.000
52.032
4
Flag Mark Frequency
*
Factor
Type
70.000
-6.571
PK
-6.751
50.000
-6.571
AV
52.560
-19.138
74.000
2.302
PK
49.730
-1.968
54.000
2.302
AV
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 47 of 90
Report No:117394R-ITCEP07V06
Site: CB7 (9x6x6_Chamber)
Time: 2011/07/26 - 17:56
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Vertical
EUT : Personal Computer
Power : AC 230V/50Hz
Note : Mode 1
No
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1
1230.000
53.003
60.610
-16.997
2
1230.000
40.593
48.200
3
4997.000
54.302
4997.000
51.732
4
Flag Mark Frequency
*
Factor
Type
70.000
-7.607
PK
-9.407
50.000
-7.607
AV
52.020
-19.698
74.000
2.282
PK
49.450
-2.268
54.000
2.282
AV
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 48 of 90
Report No:117394R-ITCEP07V06
5.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: Front View of Radiated Test
: Mode 1
: Back View of Radiated Test
Page: 49 of 90
Report No:117394R-ITCEP07V06
Test Mode
Description
: Mode 1
: Front View of High Frequency Radiated Test
Page: 50 of 90
Report No:117394R-ITCEP07V06
6. Harmonic Current Emission
6.1. Test Specification
According to EMC Standard : EN 61000-3-2
6.2. Test Setup
6.3. Limit
(a) Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8  n  40
0.23 * 8/n
11
0.33
13
0.21
15  n  39
0.15 * 15/n
Page: 51 of 90
Report No:117394R-ITCEP07V06
(b) Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents
Harmonics Order
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
n
%
2
2
3
30.λ
5
10
7
7
9
5
11  n  39
*
3
(odd harmonics only)
*λ is the circuit power factor
(d) Limits of Class D Harmonics Currents
Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11  n  39
(odd harmonics only)
Page: 52 of 90
Report No:117394R-ITCEP07V06
6.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
6.5. Deviation from Test Standard
No deviation.
Page: 53 of 90
Report No:117394R-ITCEP07V06
6.6. Test Result
Product
Personal Computer
Test Item
Power Harmonics
Test Mode
Mode 1
Date of Test
2011/08/02
Test Result: Pass
Test Site
No.3 Shielded Room
Source qualification: Normal
1.5
300
1.0
200
0.5
100
0.0
0
-0.5
-100
-1.0
-200
-1.5
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #11 with 62.28% of the limit.
Page: 54 of 90
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No:117394R-ITCEP07V06
Test Result: Pass
Source qualification: Normal
THC(A): 0.15
I-THD(%): 31.47
POHC(A): 0.010
Highest parameter values during test:
V_RMS (Volts): 229.61
Frequency(Hz):
I_Peak (Amps): 1.262
I_RMS (Amps):
I_Fund (Amps): 0.499
Crest Factor:
Power (Watts):
99.6
Power Factor:
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.001
0.132
0.000
0.064
0.000
0.009
0.000
0.028
0.000
0.021
0.000
0.006
0.000
0.011
0.000
0.005
0.000
0.005
0.000
0.003
0.000
0.001
0.000
0.005
0.000
0.002
0.000
0.006
0.000
0.003
0.000
0.002
0.000
0.002
0.000
0.003
0.000
0.002
0.000
POHC Limit(A): 0.043
50.00
0.562
2.416
0.772
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.339
39.0
0.133
0.508
26.28
Pass
0.189
33.8
0.065
0.283
23.46
Pass
0.100
9.1
0.010
0.149
6.81
Pass
0.050
56.2
0.027
0.074
38.78
Pass
0.035
61.1
0.020
0.052
42.23
Pass
0.030
19.1
0.006
0.044
14.52
Pass
0.026
43.6
0.010
0.038
31.09
Pass
0.023
20.6
0.004
0.034
16.02
Pass
0.020
26.9
0.006
0.030
21.87
Pass
0.018
16.0
0.002
0.027
17.44
Pass
0.017
8.9
0.001
0.025
9.63
Pass
0.015
32.4
0.005
0.023
23.77
Pass
0.014
14.9
0.003
0.021
13.26
Pass
0.013
47.8
0.006
0.020
35.49
Pass
0.012
25.9
0.004
0.019
21.94
Pass
0.012
16.7
0.002
0.017
18.83
Pass
0.011
16.1
0.002
0.016
15.33
Pass
0.010
26.4
0.003
0.015
20.90
Pass
0.010
19.6
0.003
0.015
17.02
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 55 of 90
Report No:117394R-ITCEP07V06
6.7. Test Photograph
Test Mode
Description
: Mode 1
: Power Harmonics Test Setup
Page: 56 of 90
Report No:117394R-ITCEP07V06
7. Voltage Fluctuation and Flicker
7.1. Test Specification
According to EMC Standard : EN 61000-3-3
7.2. Test Setup
7.3. Limit
The following limits apply:
- the value of Pst shall not be greater than 1.0;
- the value of Plt shall not be greater than 0.65;
- the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500
ms;
- the relative steady-state voltage change, dc, shall not exceed 3.3 %;
- the maximum relative voltage change, dmax, shall not exceed;
a) 4 % without additional conditions;
b)
6 % for equipment which is:
- switched manually, or
- switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit.
For example: a dmax of 6%producing a rectangular voltage change characteristic twice per
hour will give a P1t of about 0.65.
Page: 57 of 90
Report No:117394R-ITCEP07V06
c)
7 % for equipment which is:
- attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as
electric drills), or
- switched on automatically, or is intended to be switched on manually, no more than
twice per day, and also has either a delayed restart (the delay being not less than a
few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
7.5. Deviation from Test Standard
No deviation.
Page: 58 of 90
Report No:117394R-ITCEP07V06
7.6. Test Result
Product
Personal Computer
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 1
Date of Test
2011/08/02
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
0:50:06
Plt and limit line
Plt
0.50
0.25
0.00
0:50:06
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.50
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.064
Highest Plt (2 hr. period):
0.028
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 59 of 90
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Report No:117394R-ITCEP07V06
7.7. Test Photograph
Test Mode
Description
: Mode 1
: Flicker Test Setup
Page: 60 of 90
Report No:117394R-ITCEP07V06
8. Electrostatic Discharge
8.1. Test Specification
According to Standard : IEC 61000-4-2
8.2. Test Setup
8.3. Limit
Item Environmental
Units
Test Specification
Phenomena
Performance
Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge
±4 Contact Discharge
Page: 61 of 90
B
Report No:117394R-ITCEP07V06
8.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
least ten single discharges with positive and negative at the same selected point.
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
least ten single discharges with positive and negative at the same selected point.
8.5. Deviation from Test Standard
No deviation.
Page: 62 of 90
Report No:117394R-ITCEP07V06
8.6. Test Result
Product
Personal Computer
Test Item
Electrostatic Discharge
Test Mode
Mode 1
Date of Test
2011/08/01
Item
Amount of
Discharge
Test Site
Voltage
No.6 Shielded Room
Required
Criteria
Complied To
Criteria
Results
(A,B,C)
10
+8kV
B
A
Pass
10
-8kV
B
A
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(HCP)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Front)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Left)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Back)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Right)
25
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only
highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 63 of 90
Report No:117394R-ITCEP07V06
8.7. Test Photograph
Test Mode
Description
: Mode 1
: ESD Test Setup
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Report No:117394R-ITCEP07V06
9. Radiated Susceptibility
9.1. Test Specification
According to Standard : IEC 61000-4-3
9.2. Test Setup
9.3. Limit
Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port
80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 65 of 90
80
A
Report No:117394R-ITCEP07V06
9.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from
antenna to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
 f :
1%
1.5 x 10-3 decades/s
9.5. Deviation from Test Standard
No deviation.
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Report No:117394R-ITCEP07V06
9.6. Test Result
Product
Personal Computer
Test Item
Radiated susceptibility
Test Mode
Mode 1
Date of Test
2011/08/01
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength
(V/m)
Criteria
Criteria
Results
(A,B,C)
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
There was no observable degradation in performance.
EUT stopped operation and could / could not be reset by operator at
MHz.
at frequency
No false alarms or other malfunctions were observed during or after the test.
Page: 67 of 90
V/m
Report No:117394R-ITCEP07V06
9.7. Test Photograph
Test Mode
Description
: Mode 1
: Radiated Susceptibility Test Setup
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Report No:117394R-ITCEP07V06
10. Electrical Fast Transient/Burst
10.1. Test Specification
According to Standard : IEC 61000-4-4
10.2. Test Setup
10.3. Limit
Item Environmental
Units
Phenomena
I/O and communication ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input DC Power Ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input AC Power Ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Page: 69 of 90
Test Specification Performance
Criteria
+1
5/50
5
B
+0.5
5/50
5
B
+2
5/50
5
B
Report No:117394R-ITCEP07V06
10.4. Test Procedure
The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on
the table, and uses a 0.1m insulation between the EUT and ground reference plane.
The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and
projected beyond the EUT by at least 0.1m on all sides.
Test on I/O and communication ports:
The EFT interference signal is through a coupling clamp device couples to the signal and
control lines of the EUT with burst noise for 1minute.
Test on power supply ports:
The EUT is connected to the power mains through a coupling device that directly couples the
EFT/B interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.
The length of the signal and power lines between the coupling device and the EUT is 0.5m.
10.5. Deviation from Test Standard
No deviation.
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Report No:117394R-ITCEP07V06
10.6. Test Result
Product
Personal Computer
Test Item
Electrical fast transient/burst
Test Mode
Mode 1
Date of Test
2011/08/01
Inject
Line
Polarity
Voltage
kV
Test Site
Inject
Time
(Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L-N-PE
±
1kV
60
Direct
B
A
PASS
LAN
±
0.5kV
60
Clamp
B
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
Line
.
No false alarms or other malfunctions were observed during or after the test.
Page: 71 of 90
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Report No:117394R-ITCEP07V06
10.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: EFT/B Test Setup
: Mode 1
: EFT/B Test Setup-Clamp
Page: 72 of 90
Report No:117394R-ITCEP07V06
11. Surge
11.1. Test Specification
According to Standard : IEC 61000-4-5
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena Units
Test Specification Performance
Criteria
Signal Ports and Telecommunication Ports(See 1) and 2) )
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
1
Input DC Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
 0.5
AC Input and AC Output Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
Line to Line
kV
1
B
Line to Ground
kV
2
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT, no immunity test shall be required.
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Report No:117394R-ITCEP07V06
11.4. Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The length of power cord between the coupling device and the EUT shall
be 2m or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and
the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
11.5. Deviation from Test Standard
No deviation.
Page: 74 of 90
Report No:117394R-ITCEP07V06
11.6. Test Result
Product
Personal Computer
Test Item
Surge
Test Mode
Mode 1
Date of Test
2011/08/01
Inject
Line
Polarity
Angle
Test Site
Voltage
kV
Time
Interval
(Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
.
Line
No false alarms or other malfunctions were observed during or after the test.
Page: 75 of 90
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Report No:117394R-ITCEP07V06
11.7. Test Photograph
Test Mode
Description
: Mode 1
: SURGE Test Setup
Page: 76 of 90
Report No:117394R-ITCEP07V06
12. Conducted Susceptibility
12.1. Test Specification
According to Standard : IEC 61000-4-6
12.2. Test Setup
CDN Test Mode
EM Clamp Test Mode
Page: 77 of 90
Report No:117394R-ITCEP07V06
12.3. Limit
Item Environmental Phenomena Units
Signal Ports and Telecommunication Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Input DC Power Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Input AC Power Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Test
Specification
0.15-80
3
80
0.15-80
3
80
0.15-80
3
80
Performance
Criteria
A
A
A
12.4. Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the
table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground
reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for
power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
1. Field Strength
2. Radiated Signal
3. Scanning Frequency
4 Dwell Time
5. Frequency step size
 f :
6. The rate of Swept of Frequency
Remarks
130dBuV(3V) Level 2
AM 80% Modulated with 1kHz
0.15MHz – 80MHz
3 Seconds
1%
1.5 x 10-3 decades/s
12.5. Deviation from Test Standard
No deviation.
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Report No:117394R-ITCEP07V06
12.6. Test Result
Product
Personal Computer
Test Item
Conducted susceptibility
Test Mode
Mode 1
Date of Test
2011/08/01
Test Site
No.6 Shielded Room
Result
Frequency
Voltage
Inject
Tested Port
Required
Performance
Range
Applied
Method
of
Criteria
Criteria
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
Complied To
EUT
Note:
The testing performed is from lowest level up to the highest level as required by standard, but
only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
dBuV(V) at
frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 79 of 90
Report No:117394R-ITCEP07V06
12.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: Conducted Susceptibility Test Setup
: Mode 1
: Conducted Susceptibility Test Setup-CDN
Page: 80 of 90
Report No:117394R-ITCEP07V06
13. Power Frequency Magnetic Field
13.1. Test Specification
According to Standard : IEC 61000-4-8
13.2. Test Setup
13.3. Limit
Item
Environmental
Phenomena
Enclosure Port
Power-Frequency
Magnetic Field
Units
Test Specification Performance
Criteria
Hz
A/m (r.m.s.)
50
1
A
13.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central
of the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90 in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
13.5. Deviation from Test Standard
No deviation.
Page: 81 of 90
Report No:117394R-ITCEP07V06
13.6. Test Result
Product
Personal Computer
Test Item
Power frequency magnetic field
Test Mode
Mode 1
Date of Test
2011/08/01
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV
of Line
.
No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Page: 82 of 90
Report No:117394R-ITCEP07V06
13.7. Test Photograph
Test Mode
Description
: Mode 1
: Power Frequency Magnetic Field Test Setup
Page: 83 of 90
Report No:117394R-ITCEP07V06
14. Voltage Dips and Interruption
14.1. Test Specification
According to Standard : IEC 61000-4-11
14.2. Test Setup
14.3. Limit
Item Environmental
Units
Test Specification Performance
Phenomena
Input AC Power Ports
Voltage Dips
Criteria
% Reduction
30
Period
25
% Reduction
Period
Voltage Interruptions
>95
0.5
% Reduction
> 95
Period
250
Page: 84 of 90
C
B
C
Report No:117394R-ITCEP07V06
14.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is
large than 20% of lower power range, both end of specified voltage shall be tested.
Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,
for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 250 Periods with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the
voltage.
14.5. Deviation from Test Standard
No deviation.
Page: 85 of 90
Report No:117394R-ITCEP07V06
14.6. Test Result
Product
Personal Computer
Test Item
Voltage dips and interruption
Test Mode
Mode 1
Date of Test
2011/08/01
Voltage Dips and
Angle
Interruption
Test Site
Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C
C
C
C
C
C
C
C
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
C
C
C
C
C
C
C
C
Reduction(%)
30
30
30
30
30
30
30
30
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
>95
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
No.3 Shielded Room
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
Test Result
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
The nominal voltage of EUT is 230V.
EUT stopped operation and could / could not be reset by operator at
kV
of Line
.
No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Page: 86 of 90
Report No:117394R-ITCEP07V06
14.7. Test Photograph
Test Mode
Description
: Mode 1
: Voltage Dips Test Setup
Page: 87 of 90
Report No:117394R-ITCEP07V06
15. Attachment
 EUT Photograph
(1) EUT Photo
(2) EUT Photo
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Report No:117394R-ITCEP07V06
(3) EUT Photo
(4) EUT Photo
Page: 89 of 90
Report No:117394R-ITCEP07V06
(5) EUT Photo
Page: 90 of 90