MAX5922

MAX5922
MAX5922BEUI+
RELIABILITY REPORT
FOR
MAX5922BEUI+
PLASTIC ENCAPSULATED DEVICES
March 26, 2009
MAXIM INTEGRATED PRODUCTS
120 SAN GABRIEL DR.
SUNNYVALE, CA 94086
Approved by
Ken Wendel
Quality Assurance
Director, Reliability Engineering
Maxim Integrated Products. All rights reserved.
Page 1/5
MAX5922BEUI+
Conclusion
The MAX5922BEUI+ successfully meets the quality and reliability standards required of all Maxim products. In addition, Maxim"s
continuous reliability monitoring program ensures that all outgoing product will continue to meet Maxim"s quality and reliability standards.
Table of Contents
I. ........Device Description
V. ........Quality Assurance Information
II. ........Manufacturing Information
VI. .......Reliability Evaluation
III. .......Packaging Information
IV. .......Die Information
.....Attachments
I. Device Description
A. General
The MAX5922A/B/C is a single-port network power controller with an integrated power MOSFET, operating from a +32V to +60V supply rail. The
device is specifically designed for power-sourcing equipment (PSE) in power-over-LAN applications and is fully compliant to the IEEE® 802.3af
standard. The MAX5922 provides power devices (PD) discovery, classification, current limit, and other necessary functions for an IEEE 802.3af
compliant PSE. The MAX5922 is suitable for PSE function in both switch/router systems where the power is delivered to the load through the signal
pairs, and in midspan systems where the power is delivered to the load through the spare pairs. In midspan mode, a detection collision avoidance
circuit (MAX5922A/C only) provides the necessary back-off timing to prevent fault detections that happen when two different PSEs try to detect and
power the same PD. The MAX5922B/C have a detection disable input that can be connected high to disable the detection/classification functions or
connected low to enable them. The MAX5922 features a programmable undervoltage lockout (UVLO) that keeps the device in shutdown until the
input voltage exceeds a certain threshold, set to 38V (MAX5922A) or 28V (MAX5922B/C) internally. After successfully discovering and classifying a
PD, the MAX5922 enters startup mode. During startup, the MAX5922 limits the output voltage and current slew rate to minimize EMI (electromagnetic
interference). The MAX5922 has an integrated 0.45 N-channel power MOSFET that provides efficient operation and simplified system design. The
MAX5922 monitors and provides current-limit protection to the load at all times. The current limit is programmable using an external current-sensing
resistor. The MAX5922 features current-limit foldback and duty-cycle limit to ensure robust operation during load-fault and short-circuit conditions.
Fault management allows the part to either latch-off or autorestart after a fault. The MAX5922 provides POK, active-low ZC, and active-low FAULT
status signals to indicate output power is good, zero-current fault, and other faults (overcurrent, overtemperature), respectively. The MAX5922 is
available in a 28-pin TSSOP package and is rated over the extended -40°C to +85°C temperature range.
Maxim Integrated Products. All rights reserved.
Page 2/5
MAX5922BEUI+
II. Manufacturing Information
A. Description/Function:
+48V, Single-Port Network Power Switch For Power-Over-LAN
B. Process:
BCD8
C. Number of Device Transistors:
D. Fabrication Location:
Oregon
E. Assembly Location:
Carsem Malaysia, ATP Philippines, UTL Thailand
F. Date of Initial Production:
April 15, 2003
III. Packaging Information
A. Package Type:
28-pin TSSOP
B. Lead Frame:
Copper
C. Lead Finish:
100% matte Tin
D. Die Attach:
Conductive Epoxy
E. Bondwire:
Gold (1 mil dia.)
F. Mold Material:
Epoxy with silica filler
G. Assembly Diagram:
#05-9000-0448
H. Flammability Rating:
Class UL94-V0
I. Classification of Moisture Sensitivity per
JEDEC standard J-STD-020-C
Level 1
J. Single Layer Theta Ja:
78°C/W
K. Single Layer Theta Jc:
12.5°C/W
L. Multi Layer Theta Ja:
71.6°C/W
M. Multi Layer Theta Jc:
13°C/W
IV. Die Information
A. Dimensions:
108 X 175 mils
B. Passivation:
Si3N4/SiO2 (Silicon nitride/ Silicon dioxide
C. Interconnect:
Aluminum/Si (Si = 1%)
D. Backside Metallization:
None
E. Minimum Metal Width:
3.0 microns (as drawn)
F. Minimum Metal Spacing:
3.0 microns (as drawn)
G. Bondpad Dimensions:
5 mil. Sq.
H. Isolation Dielectric:
SiO2
I. Die Separation Method:
Wafer Saw
Maxim Integrated Products. All rights reserved.
Page 3/5
MAX5922BEUI+
V. Quality Assurance Information
A. Quality Assurance Contacts:
Ken Wendel (Director, Reliability Engineering)
Bryan Preeshl (Managing Director of QA)
B. Outgoing Inspection Level:
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate:
< 50 ppm
D. Sampling Plan:
Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( ) is calculated as
follows:
=
1
MTTF
=
1.83
192 x 4340 x 180 x 2
(Chi square value for MTTF upper limit)
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
-9
= 6.0 x 10
= 6.0 F.I.T. (60% confidence level @ 25°C)
The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly 1000
hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maxim-ic.com/.
Current monitor data for the BCD8 Process results in a FIT Rate of 2.3 @ 25C and 39.6 @ 55C (0.8 eV, 60% UCL)
B. Moisture Resistance Tests
The industry standard 85°C/85%RH or HAST testing is monitored per device process once a quarter.
C. E.S.D. and Latch-Up Testing
The NP38-2 die type has been found to have all pins able to withstand a HBM transient pulse of +/-400 V per Mil-Std 883
Method 3015.7. Latch-Up testing has shown that this device withstands a current of +/-250 mA.
Maxim Integrated Products. All rights reserved.
Page 4/5
MAX5922BEUI+
Table 1
Reliability Evaluation Test Results
MAX5922BEUI+
TEST ITEM
TEST CONDITION
Static Life Test (Note 1)
Ta = 135°C
Biased
FAILURE
IDENTIFICATION
SAMPLE SIZE
NUMBER OF
FAILURES
DC Parameters
& functionality
180
0
DC Parameters
& functionality
77
0
DC Parameters
& functionality
77
0
Time = 192 hrs.
Moisture Testing (Note 2)
85/85
Ta = 85°C
RH = 85%
Biased
Time = 1000hrs.
Mechanical Stress (Note 2)
Temperature
-65°C/150°C
Cycle
1000 Cycles
Method 1010
Note 1: Life Test Data may represent plastic DIP qualification lots.
Note 2: Generic Package/Process data
Maxim Integrated Products. All rights reserved.
Page 5/5
Was this manual useful for you? yes no
Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

Download PDF

advertisement