Migrating to the S29CD016J

ACC Programming, CFI, and Autoselect Changes

Application Note

1.

Overview

Migrating to the S29CD016J from either the Am29BDD016G or S29CD016G is a very simple process, but designers should be aware of a few differences between these parts. The changes include improved programming times, CFI table updates that reflect the performance change and a 3-byte chip ID vs. the 1byte chip ID used in the Am29BDD016G.

2.

Differences in Programming Times

Table 2.1

shows a comparison between the Am29BDD016G, S29CD016G, and S29CD016J programming times. The first two rows show the total time required to program a double word for each of the three devices, including the time required to issue the program command (bypass mode reduces the number of write command cycles needed to program). In both Standard and Bypass Mode the S29CD016J programs more than twice as fast as either the BDD160G or CD016G.

The last row of Table 2.1

shows the programming time of all three devices in the Accelerated Program mode

(ACC Mode). The ACC mode requires the user to place V

HH

(12V ± 0.5V) on the ACC pin to facilitate faster programming. The ACC mode also activates the Unlock Bypass mode, requiring only two of the four write command cycles. In the Am29BDD016G and S29CD016G there is a significant improvement in total programming time between the ACC mode and the standard mode. However, due to improvements in technology, the S29CD016J programming time is almost the same in the ACC mode as in the standard mode. The slight improvement is due to the Unlock Bypass mode effect in the ACC mode.

Table 2.1 Programming Time Comparisons of Am29BDD016G, S29CD016G, and S29CD016J

Operation

(for 1 double word)

Standard Program Time

Program Time in Unlock Bypass Mode

Program Time in ACC Mode

Am29BDD016G

18.24 µs

18.12 µs

8.12 µs

CD016G

18.24 µs

18.12 µs

8.12 µs

CD016J

8.24 µs

8.12 µs

8.12 µs

Publication Number migrating_s29cd016j_an Revision A Amendment 0 Issue Date January 10, 2006

2

A p p l i c a t i o n N o t e

3.

Differences in the Common Flash Interface (CFI)

The Common Flash Interface (CFI) is a standard that provides system recognition between the flash device

and the host system. Table 3.1

highlights the changes in the CFI code between the Am29BDD016G,

S29CD016G and S29CD016J.

Table 3.1 CFI Comparison between Am29BDD016G, S29CD016G, and S29CD016J

Addresses Am29BDD016G S29CD016G S29CD016J

1Bh

1Fh

25h

28h

0023h

0004h

0007h

0005h

0023h

0004h

0007h

0005h

0025h

0003h

0004h

0003h

Description

V

CC

Min. (erase/program) (D7-D4: volts, D3-D0: 100 millivolts)

Typical timeout per single double word program 2

N

µs

Max. timeout per individual block erase 2

N

times typical

Flash Device Interface Description: 03 = x32-only

45h

51h

0004h

0000h

0004h

0000h

000Ch

0001h

Address Sensitive Unlock (Bits 1-0) 00b = Required,

01b = Not Required

Process Technology (Bits 5-2) 0011b = 0.11um

Floating Gate Technology

0001b = 0.170nm Floating Gate Technology

Unlock Bypass

00 = Not Supported, 01 = Supported

4.

Differences in the Autoselect Codes

In order to ease the migration path from the Am29BDD016G and S29CD016G to the S29CD016J, the latter devices have two different autoselect options. The autoselect mode is primarily intended for programming equipment to automatically identify the flash device through identifier codes output on DQ7-DQ0. Both the

S29CD016G and S29CD016J have an autoselect option (08h during the second read cycle) which is equivalent to the Am29BDD016G, allowing the user to drop-in the new device without having to alter their autoselect code. The S29CD016J also shares the same autoselect code (36h during the second read cycle) as the S29CD016G to simplify the migration.

Table 4.1

shows the comparison between the autoselect code options in the three devices.

Table 4.1 Autoselect Code Comparison between Am29BDD016G, S29CD016G, S29CD016J

Am29BDD016G

Autoselect Code

(2nd Read Cycle)

08h

Note

The S29CL016J (3V) device has a different autoselect code from the S29CD016J.

S29CD016G

08h (BDD)

36h (CD-G)

S29CD016J

08h (BDD)

36h (CD-G)

For more information regarding the autoselect mode, please refer to the data sheet. For more information on how to order the different autoselect options, please see the “Migrating from Am29BDD016G to S29CD016J

– Ordering Information” application note.

5.

Summary

When migrating between these devices it is important to note that the programming times of the S29CD016J, unlike the Am29BDD016G and S29CD016G, do not differ when utilizing or not utilizing the ACC feature.

Furthermore, there are some minor differences in the CFI code between the three devices that should be noted. Lastly, in order to simplify the migration path the S29CD016G and S29CD016J offers two different autoselect options which allows the user to drop-in the new flash device without code modifications. These differences are important to understand when migrating from the Am29BDD016G or S29CD016G to the

S29CD016J.

Migrating to the S29CD016J migrating_s29cd016j_an_A0 January 10, 2006

A p p l i c a t i o n N o t e

6.

Revision History

Section

Revision A0 (January 10, 2006)

Initial release.

Description

Colophon

The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion will not be liable to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior authorization by the respective government entity will be required for export of those products.

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The contents of this document are subject to change without notice. This document may contain information on a Spansion product under development by Spansion. Spansion reserves the right to change or discontinue work on any product without notice. The information in this document is provided as is without warranty or guarantee of any kind as to its accuracy, completeness, operability, fitness for particular purpose, merchantability, non-infringement of third-party rights, or any other warranty, express, implied, or statutory. Spansion assumes no liability for any damages of any kind arising out of the use of the information in this document.

Copyright © 2006 Spansion Inc. All Rights Reserved. Spansion, the Spansion logo, MirrorBit, ORNAND, HD-SIM, and combinations thereof are trademarks of Spansion Inc. Other names are for informational purposes only and may be trademarks of their respective owners.

January 10, 2006 migrating_s29cd016j_an_A0 Migrating to the S29CD016J 3