PLANAR 804/1 Data Sheet
PLANAR 804/1
Vector Network Analyzer
KEY FEATURES
Frequency range: 100 kHz – 8 GHz
Measured parameters: S11, S12, S21, S22
Wide output power range: -60 dBm to +10 dBm
>145 dB dynamic range (1 Hz IF bandwidth)
Time domain and gating conversion included
Fixture simulation
Frequency offset mode, including vector
mixer calibration measurements
Up to 500,001 measurement points
Measurement time per point: 100 µs per point
Up to 16 logical channels with 16 traces each
Multiple precision calibration methods
and automatic calibration
COM/DCOM compatible for LabView
and automation programming
COPPER MOUNTAIN TECHNOLOGIES
3905 Vincennes Road, Suite 105 | Indianapolis, IN 46268, USA | ph: +1.317.222.5400 | fx: +1.317.222.5219
coppermountaintech.com
Real Performance, Real Value.
Advanced
CMT analyzers take advantage of breakthrough advances in RF technology as well as
the faster processing power, larger display, and more reliable performance of an external
PC, while also simplifying maintenance of the analyzer.
Accurate
Our VNAs are made with high standards. Every instrument is lab-grade quality, with
a wide dynamic range, low noise floor, high resolution sweep, and a variety of other
advanced features. The metrology of the Planar 804/1 delivers real measurement
accuracy and reliability.
Cost Effective
CMT VNAs are flexible, easy to maintain, and are well-suited for lab, production, field,
and secure testing environments. With every bit of performance of traditional analyzers,
but at a fraction of the cost, now every engineer and technician can have a highly
accurate VNA.
PLANAR 804/1 VNA | Data Sheet
The Planar 804/1 VNA is an S-parameter
vector network analyzer designed for
operation with an external PC. It connects
to any Windows-based computer via
USB and delivers accurate testing and
measurement through a platform that
can keep up with constant advancements
as well as be remotely accessed.
This analyzer is an excellent solution for
performing the full range of magnitude and
phase measurements over the frequency
from 300 kHz to 8.0 GHz. The following
product brochure outlines the various
features that are standard on the device.
Front Panel
LED Indicator
for Port 1
LED Indicator LED Indicator
for Port 2
for Power On
PL ANAR 804 /1
N E T W O R K A N A LY Z E R 0.1 M H z - 8. 0 G H z
PORT 1 50
PORT 2 50
+26dBm RF 35V DC Max Avoid Static Discharge CAT I
Test Port 1
Test Port 2
Power Switch
Rear Panel
Power cable
receptacle
PLANAR 804/1
# 12035021
MADE IN RUSSIA
USB 2.0
External External Reference
trigger reference frequency
input frequency output
connector input
connector
connector
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PLANAR 804/1 VNA | Data Sheet
Measurement Capabilities
Measured parameters
S11, S21, S12, S22 and absolute power of the
reference and received signals at the port.
Number of measurement channels
Up to 16 independent logical channels: each
logical channel is represented on the screen as an
individual channel window. A logical channel is
defined by such stimulus signal settings as frequency
range, number of test points, or power level.
Data traces
Up to 16 data traces can be displayed in each
channel window. A data trace represents one of
such parameters of the DUT as S-parameters,
response in time domain, input power response.
Memory traces
Each of the 16 data traces can be saved into memory
for further comparison with the current values.
Data display formats
Logarithmic magnitude, linear magnitude, phase,
expanded phase, group delay, SWR, real part,
imaginary part, Smith chart diagram and polar
diagram display formats are available.
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PLANAR 804/1 VNA | Data Sheet
Dynamic Range
Typical dynamic range of 150 dB is achieved through
the entire frequency range (at 1 Hz IF bandwidth). Seen
here is the maximum dynamic range achieved when using
IFBW 1 Hz and an output power level of 10 dBm.
Low Measurement Errors
Low trace noise allows for particularly high-precision
measurements. This graph shows the variation of the
absolute value of the measurement error of S21 and
S12 when the value of |S21| and |S12| is -50 dB, using 42
different Planar 804/1 VNAs. With the model's specificed
accuracy of ± 0.1 dB, the trace clearly shows that the
variation within the device pool is well below that
figure. This confirms the precision of the instrument.
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PLANAR 804/1 VNA | Data Sheet
Sweep Features
Sweep type
Linear frequency sweep, logarithmic frequency
sweep, and segment frequency sweep occur when
the stimulus power is a fixed value. Linear power
sweep occurs when frequency is a fixed value.
Measured points per sweep
Set by the user from 2 to 500,001.
Segment sweep features
A frequency sweep within several independent user-defined
segments. Frequency range, number of sweep points, source
power, and IF bandwidth should be set for each segment.
Power
Source power from –60 dBm to +10 dBm with resolution of
0.05 dB. In frequency sweep mode, the power slope
can be set to up to 2 dB/GHz for compensation of
high frequency attenuation in connection wires.
Sweep trigger
Trace Functions
Trigger modes: continuous, single, or hold.
Trigger sources: internal, manual, external, bus
Trace display
Data trace, memory trace, or simultaneous
indication of data and memory traces.
Trace math
Data trace modification by math operations:
addition, subtraction, multiplication or division
of measured complex values and memory data.
Autoscaling
Automatic selection of scale division and
reference level value allow the most
effective display of the trace.
Electrical delay
Calibration plane moving to compensate for
the delay in the test setup. Compensation for
electrical delay in a device under test (DUT) during
measurements of deviation from linear phase.
Phase offset
Phase offset is defined in degrees.
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PLANAR 804/1 VNA | Data Sheet
Frequency Scan Segmentation
The VNA has a large frequency range with the
option of frequency scan segmentation. This
allows optimal use of the device, for example, to
realize the maximum dynamic range while
maintaining high measurement speed.
Power Scanning and
Compression Point Recognition
The power sweep feature turns compression
point recognition, one of the most fundamental
and complex amplifier measurements, into
a simple and accurate operation.
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PLANAR 804/1 VNA | Data Sheet
Mixer/Converter Measurements
Scalar mixer / converter measurements
PLANAR 804 /1
N E T W OR K A N A LY Z E R 0.1 M H z - 8 . 0 GH z
PORT2 50
PORT1 50
+26dBm RF 35V DC Max Avoid Static Discharge CAT I
Mixer Under Test
The scalar method allows the user to measure only the
magnitude of the transmission coefficient of the mixer and
other frequency translating devices. No external mixers
or other devices are required. The scalar method employs
port frequency offset when there is a difference between
the source port frequency and the receiver port frequency.
Scalar mixer / converter calibration
This is the most accurate method of calibration applied
for measurements of mixers in frequency offset mode.
The OPEN, SHORT, and LOAD calibration standards
are used. An external power meter should be connected
to the USB port directly or via USB/GPIB adapter.
G
Vector mixer / converter measurements
PLANAR 804 /1
N E T W OR K A N A LY Z E R 0.1 M H z - 8 . 0 GH z
PORT2 50
PORT1 50
+26dBm RF 35V DC Max Avoid Static Discharge CAT I
Calibration Mixer/Filter
Mixer Under Test
The vector method allows the measurement of both the
magnitude and phase of the mixer transmission coefficient.
This method requires an external mixer and an LO common
for both the external mixer and the mixer under test.
Vector mixer /converter calibration
This method of calibration is applied for vector
mixer measurements. OPEN, SHORT and
LOAD calibration standards are used.
G
Automatic frequency offset adjustment
The function performs automatic frequency offset
adjustment when the scalar mixer / converter
measurements are performed to compensate for
internal LO setting inaccuracy in the DUT.
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PLANAR 804/1 VNA | Data Sheet
Time Domain Measurements
This function performs data transformation from frequency
domain into response of the DUT to various stimulus
types in time domain. Modeled stimulus types: bandpass,
lowpass impulse, and lowpass step. Time domain span is
set by the user arbitrarily from zero to maximum, which
is determined by the frequency step. Windows of various
forms are used for better tradeoff between resolution
and level of spurious sidelobes.
Here, built-in time domain analysis
allows the user to detect a physical
impairment in the antenna feeder.
Time Domain analysis allows
measurement of parameters of SAW
filters such as the signal time delay,
feedthrough signal suppression.
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PLANAR 804/1 VNA | Data Sheet
Time Domain Gating
This function mathematically removes unwanted responses
in the time domain, which allows the user to obtain
frequency response without influence from fixture elements.
This function applies reverse transformation back to the
frequency domain after cutting out the user-defined span in
time domain. Gating filter types: bandpass or notch. For a
better tradeoff between gate resolution and level of spurious
sidelobes the following filter shapes are available:
maximum, wide, normal and minimum.
Applications of these features include, but are not limited to:
measurement of SAW filter parameters, such as filter
time delay or forward transmission attenuation.
Limit Testing
Limit testing is a function of automatic pass/fail judgment
for the trace of the measurement results. The judgment is
based on the comparison of the trace to the limit line set
by the user and can consist of one or several segments.
Each segment checks the measurement value for
failing either the upper or lower limit, or both. The
limit line segment is defined by specifying the
coordinates of the beginning (X0, Y0) and the end
(X1, Y1) of the segment, and type of the limit. The
MAX or MIN limit types check if the trace falls
outside of the upper or lower limit, respectively.
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PLANAR 804/1 VNA | Data Sheet
Embedding
This function allows the user to mathematically simulate
DUT parameters by virtually integrating a fixture circuit
between the calibration plane and the DUT. This circuit
should be described by an S-parameter matrix
in a Touchstone file.
De-Embedding
This function allows the user to mathematically
exclude the effect of the fixture circuit connected
between the calibration plane and the DUT from the
measurement results. This circuit should be described
by an S-parameter matrix in a Touchstone file.
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PLANAR 804/1 VNA | Data Sheet
Port Impedance Conversion
The function of conversion of the S-parameters measured
at 50 port into the values, which could be determined
if measured at a test port with arbitrary impedance.
S-Parameter Conversion
The function allows conversion of the measured
S-parameters to the following parameters: reflection
impedance and admittance, transmission impedance
and admittance, and inverse S-parameters.
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PLANAR 804/1 VNA | Data Sheet
Data Output
Analyzer State
All state, calibration and measurement data can be saved to
an Analyzer state file on the hard disk and later uploaded
back into the software program. The following four types of
saving are available: State, State & Cal, Stat & Trace, or All.
Channel State
A channel state can be saved into the Analyzer memory.
The channel state saving procedure is similar to saving of
the Analyzer state saving, and the same saving types are
applied to the channel state saving. Unlike the Analyzer
state, the channel state is saved into the Analyzer inner
volatile memory (not to the hard disk) and is cleared
when the power to the Analyzer is turned off. For
channel state storage, there are four memory registers
A, B, C, D. The channel state saving allows the user to
easily copy the settings of one channel to another one.
Trace Data CSV File
The Analyzer allows the use to save an individual trace data
as a CSV file (comma separated values). The active trace
stimulus and response values in current format are saved
to *.CSV file. Only one trace data are saved to the file.
Trace Data Touchstone File
The Analyzer allows the user to save S-parameters to
a Touchstone file. The Touchstone file contains the
frequency values and S-parameters. The files of this format
are typical for most of circuit simulator programs.
The *.s2p files are used for saving all the
four S-parameters of a 2-port device.
The *.s1p files are used for saving S11 and
S22 parameters of a 1-port device.
Only one (active) trace data are saved to the file.
The Touchstone file saving function is
applied to individual active channels.
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PLANAR 804/1 VNA | Data Sheet
Screenshot capture
The print function is provided with the preview feature,
which allows the user to view the image to be printed
on the screen, and/or save it to a file. Screenshots can be
printed using three different applications: MS Word, Image
Viewer for Windows, or the Print Wizard of the Analyzer.
Each screenshot can be printed in color, grayscale,
black and white, or inverted for visibility or ink use.
The current date and time can be added to each capture
before it is transferred to the printing application,
resulting in quick and easy test reporting.
Measurement Automation
COM/DCOM compatible
Planar 804/1 software is COM/DCOM compatible, which
allows the unit to be used as a part of an ATE station and
other special applications. COM/DCOM automation is used
for remote control and data exchange with the user software.
The Analyzer program runs as COM/DCOM server.
The user program runs as COM/DCOM client. The
COM client runs on Analyzer PC. The DCOM client
runs on a separate PC connected via LAN.
LabView compatible
The device and its software are fully compatible with
LabView applications, for ultimate flexibility in
user-generated programming and automation.
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PLANAR 804/1 VNA | Data Sheet
Accuracy Enhancement
Calibration
Calibration of a test setup (which includes the VNA, cables, and adapters)
significantly increases the accuracy of measure-ments. Calibration allows for
correction of the errors caused by imperfections in the measurement system:
system directivity, source and load match, tracking and isolation.
Calibration methods
The following calibration methods of various sophistication
and accuracy enhancement level are available:
reflection and transmission normalization
full one-port calibration
one-path two-port calibration
full two-port calibration
Reflection and transmission normalization
This is the simplest calibration method; however, it provides
reasonably low accuracy compared to other methods.
Full one-port calibration
Method of calibration performed for one-port reflection
measurements. It ensures high accuracy.
One-path two-port calibration
Method of calibration performed for reflection and one-way transmission
measurements, for example for measuring S11 and S21 only. It ensures high accuracy
for reflection measure-ments, and mean accuracy for transmission measurements.
Full two-port calibration
This method of calibration is performed for full S-parameter matrix
measurement of a two-port DUT, ensuring high accuracy.
TRL calibration
Method of calibration performed for full S-parameter matrix measurement
of a two-port DUT. It ensures higher accuracy than two-port calibration.
LRL and LRM modifications of this calibration method are available.
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PLANAR 804/1 VNA | Data Sheet
Mechanical Calibration Kits
The user can select one of the predefined calibration kits of
various manufacturers or define own calibration kits.
Electronic Calibration Modules
Electronic, or automatic, calibration modules offered by CMT make the analyzer
calibration faster and easier than traditional mechanical calibration.
Sliding load calibration standard
The use of sliding load calibration standard allows significant increase in calibration
accuracy at high frequencies compared to the fixed load calibration standard.
“Unknown” Thru calibration standard
The use of a generic two-port reciprocal circuit instead of a Thru in full two-port calibration
allows the user to calibrate the VNA for measurement of "non-insertable" devices.
Defining of calibration standards
Different methods of calibration standard defining are available:
standard defining by polynomial model
standard defining by data (S-parameters)
Error correction interpolation
When the user changes any settings such as the start/stop frequencies and number of sweep
points, compared to the settings at the moment of calibration, interpolation or extrapolation
of the calibration coefficients will be applied.
Supplemental Calibration Methods
Power calibration
Power calibration allows more stable maintainance of the
power level setting at the DUT input. An external power
meter should be connected to the USB port directly
or via USB/GPIB adapter.
Receiver calibration
This method calibrates the receiver gain at the
absolute signal power measurement.
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PLANAR 804/1 VNA | Data Sheet
TECHNICAL SPECIFICATIONS
MEASUREMENT RANGE
Impedance 50 Ω (75 Ω connectors via adapters)
Test port connector N-type, female
Number of test ports 2
Frequency range 100 kHz to 8.0 GHz
Full CW frequency accuracy ±5x10 ̄ 6
Frequency setting resolution 1 Hz
Number of measurement points 1 to 500,001
Measurement bandwidths 1 Hz to 30 kHz (with 1/1.5/2/3/5/7 steps)
Dynamic range (IF bandwidth 10 Hz)
From 100 kHz to 300 kHz: 115 dB, typ. 125 dB
From 300 kHz to 8.0 GHz: 135 dB, typ. 140 dB
MEASUREMENT ACCURACY
Accuracy of transmission measurements (magnitude / phase)¹
+5 dB to +15 dB 0.2 dB / 2°
-50 dB to +5 dB 0.1 dB / 1°
From 100 kHz to 300 kHz: 1.5 dB / 10°
-70 dB to -50 dB
From 300 kHz to 8.0 GHz: 0.2 dB / 2°
-90 dB to -70 dB From 300 kHz to 8.0 GHz: 1.0 dB / 6°
Accuracy of reflection measurements (magnitude / phase)¹
-15 dB to 0 dB 0.4 dB / 3°
-25 dB to -15 dB 1.0 dB / 6°
-35 dB to -25 dB 3.0 dB / 20°
Trace stability
Trace noise magnitude From 100 kHz to 300 kHz: 5 mdB rms
(IF bandwidth 3 kHz) From 300 kHz to 8.0 GHz: 1 mdB rms
Temperature dependence 0.02 dB
(per one degree of temperature variation)
EFFECTIVE SYSTEM DATA¹
Effective directivity 46 dB
Effective source match 40 dB
Effective load match 46 dB
TEST PORT
100 kHz to 300 kHz: 15 dB
Directivity (without system error correction)
300 kHz to 8.0 GHz: 18 dB
1 applies over the temperature range of 73°F ± 9 °F (23°C ± 5 °C) after 40 minutes of warming-up, with less than 1 °C
deviation from the one-path two-port calibration temperature, at output power of -5 dBm, and 10 Hz IF bandwidth.
*All technical specifications apply to all devices that have been factory calibrated in 2013 and after.
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PLANAR 804/1 VNA | Data Sheet
TEST PORT OUTPUT
Match (without system error correction) 18 dB
Power range: 100 kHz to 6.0 GHz -60 dBm to +10 dBm
Power range: 6.0 GHz to 8.0 GHz -60 dBm to +5 dBm
Power accuracy ±1.5 dB
Power resolution 0.05 dB
Harmonics distortion From 300 kHz to 8.0 GHz: -25 dBc
Non-harmonic spurious From 300 kHz to 8.0 GHz: -30 dBc
TEST PORT INPUT
Match (without system error correction) 18 dB
Damage level +26 dBm
Damage DC voltage 35 V
Noise level (defined as the rms value From 100 kHz to 300 kHz: -105 dBm
of the specified noise floor, IF bandwidth 10 Hz) From 300 kHz to 8.0 GHz: -125 dBm
MEASUREMENT SPEED
Measurement time per point 100 µs
Source to receiver port switchover time 10 ms
Typical cycle time versus number of measurement points
Number of points
201
401
51
Start 100 kHz, stop 10 MHz,
IF bandwidth 30 kHz
Start 10 MHz, stop 8.0 GHz,
IF bandwidth 30 kHz
Uncorrected 13.1 ms
51.3 ms
102.3 ms
408.3 ms
Full two-port calibration 45.5 ms
122.0 ms
230.5 ms
840.5 ms
Uncorrected
6.5 ms
21.1 ms
40.5 ms
157.7 ms
Full two-port calibration 32.4 ms
61.7 ms
100.3 ms
333.0 ms
GENERAL DATA
External reference frequency
External reference frequency 10 MHz
Input level 2 dBm ± 2 dB
Input impedance at «10 MHz» input 50 Ω
Connector type BNC female
Output reference signal
Output reference signal level 3 dBm ± 2 dB
at 50 Ω impedance
«OUT 10 MHz» connector type BNC female
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Atmospheric tolerances
Operating temperature range +41 °F to +104 °F (+5 °C to +40 °C)
Storage temperature range -49 °F to +131 °F (-45 °C to +55 °C)
Humidity 90% at 77 °F (25 °C)
Atmospheric pressure 84 to 106.7 kPa
Calibration Frequency
Calibration interval 3 years
External PC system requirements
Operating system Windows XP, Vista, 7, 8
CPU frequency 1 GHz
RAM 512 MB
Power supply
Power supply 110-240 V, 50/60 Hz
Power consumption 40 W
Dimensions (L x W x H) 12.8 x 16.3 x 3.8 in (324 x 415 x 96 mm)
Weight 15.4 lbs (7 kg)
Copper Mountain Technologies is changing the way VNAs are used in the industry. Our unique
VNAs deliver highly accurate measurements at a fraction of the price of traditional instrumentation.
Leveraging breakthrough advances in RF technology, CMT manages to compress an advanced
feature set and high performance into a compact form factor. We specialize in making affordable
high performance analyzers for many environments and applications, with a wide variety of
solutions from 20 kHz to 14 GHz.
For a complete listing of our global sales network,
please visit www.coppermountaintech.com
COPPER MOUNTAIN TECHNOLOGIES
3905 Vincennes Road, Suite 105 | Indianapolis, IN 46268, USA | ph: +1.317.222.5400 | fx: +1.317.222.5219
coppermountaintech.com
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