N5990A User Guide for SATA

N5990A User Guide for SATA
Keysight N5990A
Test Automation
Software Platform for
SATA
User Guide
Contents
2
N5990A User Guide for SATA
Notices
© Keysight Technologies, Inc. 2014
No part of this manual may be reproduced in
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electronic storage and retrieval or translation
into a foreign language) without prior
agreement and written consent from Keysight
Technologies, Inc. as governed by United
States and international copyright laws.
Manual Part Number
N5990-91050
Edition
Second edition, October 2014
Keysight Technologies, Deutschland GmbH
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Warranty
The material contained in this document is
provided “as is,” and is subject to being
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The hardware and/or software described in
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any technical data.
Safety Notices
CAUTION
A CAUTION notice denotes a hazard.
It calls attention to an operating
procedure, practice, or the like that, if
not correctly performed or adhered
to, could result in damage to the
product or loss of important data. Do
not proceed beyond a CAUTION
notice until the indicated conditions
are fully understood and met.
WARNING
A WARNING notice denotes a hazard.
It calls attention to an operating
procedure, practice, or the like that, if
not correctly performed or adhered
to, could result in personal injury or
death. Do not proceed beyond a
WARNING notice until the indicated
conditions are fully understood and
met.
A NOTE provides important or special
information
Contents
Contents
Contents ........................................................................................................................................... 5
1
Introduction ....................................................................................................................... 9
1.1
What’s in This Chapter ....................................................................................... 9
1.1.1
1.2
2
Document History ............................................................................................... 9
N5990A Overview ............................................................................................................ 11
2.1
3
Test Automation Software Platform ................................................................. 11
Using Software ................................................................................................................ 13
3.1
Test Station Configuration ................................................................................ 13
3.1.1
3.2
3.2.3
3.3
Using Keysight IO VISA Connection Expert ....................................... 17
Starting Test Station ......................................................................................... 19
3.2.1
3.2.2
Configuring DUT ................................................................................ 20
Selecting, Modifying, & Running Tests .............................................. 23
3.2.2.1 System Calibration ............................................................. 25
3.2.2.2 Selecting Procedures ......................................................... 25
3.2.2.3 Modifying Parameters ........................................................ 26
3.2.2.4 Running Procedures ........................................................... 27
Results ............................................................................................... 27
3.2.3.1 Run-Time Data Display ...................................................... 28
3.2.3.2 MS-Excel Workbook........................................................... 31
3.2.3.3 Smiley's Representation ..................................................... 33
Oscilloscope Transmitter Test Integration ........................................................ 34
3.3.1
3.3.2
4
Overview of This Guide ........................................................................ 9
Using the Software ............................................................................ 34
Trouble Shooting ............................................................................... 37
3.3.2.1 Wrong version of the transmitter test application ............. 38
3.3.2.2 Error message at start-up and connection fails ................ 38
3.3.2.3 Transmitter test application and oscilloscope seem .............
to hang .............................................................................. 39
SATA Computer Bus Test Application ............................................................................. 41
4.1
Introduction ...................................................................................................... 41
4.2
Supported Hardware Configurations ............................................................... 43
4.3
ValiFrame SATA Station.................................................................................... 43
4.3.1
4.3.2
4.3.3
N5990A User Guide for SATA
ValiFrame SATA Station Configuration ............................................. 43
4.3.1.1 Data Generator................................................................... 46
4.3.1.2 Error Detector .................................................................... 46
4.3.1.3 Rx BIST Control .................................................................. 46
4.3.1.4 Tx BIST Control .................................................................. 47
4.3.1.5 Power Switch ..................................................................... 47
Starting ValiFrame SATA Station ...................................................... 49
Configuring the DUT .......................................................................... 50
4.3.3.1 DUT Parameters ................................................................. 51
5
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4.3.3.2
4.4
Calibration and Test Procedures ...................................................................... 58
4.4.1
4.4.2
4.4.3
4.5
4.5.4
4.5.5
4.5.6
Calibration Overview.......................................................................... 64
Group Parameters for Calibration ..................................................... 65
De-Emphasis Calibration ................................................................... 65
4.5.3.1 Purpose .............................................................................. 66
4.5.3.2 Procedure ........................................................................... 67
4.5.3.3 Connection Diagram .......................................................... 68
4.5.3.4 Parameters ......................................................................... 68
4.5.3.5 Dependencies ..................................................................... 69
4.5.3.6 Results ................................................................................ 69
Random Jitter Calibration ................................................................. 71
4.5.4.1 Purpose .............................................................................. 72
4.5.4.2 Procedure ........................................................................... 72
4.5.4.3 Connection Diagram .......................................................... 72
4.5.4.4 Parameters ......................................................................... 74
4.5.4.5 Dependencies ..................................................................... 75
4.5.4.6 Results ................................................................................ 75
Sinusoidal Jitter Calibration .............................................................. 77
4.5.5.1 Purpose .............................................................................. 77
4.5.5.2 Procedure ........................................................................... 78
4.5.5.3 Connection Diagram .......................................................... 78
4.5.5.4 Parameters ......................................................................... 78
4.5.5.5 Dependencies ..................................................................... 79
4.5.5.6 Results ................................................................................ 79
Differential Voltage Calibration ......................................................... 81
4.5.6.1 Purpose .............................................................................. 81
4.5.6.2 Procedure ........................................................................... 82
4.5.6.3 Connection Diagram .......................................................... 83
4.5.6.4 Parameters ......................................................................... 83
4.5.6.5 Dependencies ..................................................................... 84
4.5.6.6 Results ................................................................................ 85
Receiver Test Procedures ................................................................................. 87
4.6.1
4.6.2
4.6.3
4.6.4
Gen3)
4.6.5
6
Example for Calibration and Test Procedure ..................................... 58
Connection Diagram .......................................................................... 59
SATA Parameters Types .................................................................... 61
4.4.3.1 Sequencer Parameters ....................................................... 62
4.4.3.2 Group Parameters .............................................................. 62
4.4.3.3 Procedure Parameters ....................................................... 63
SATA Calibration Procedures ........................................................................... 64
4.5.1
4.5.2
4.5.3
4.6
Edit Parameters .................................................................. 53
Dependencies for All Receiver Tests ................................................. 88
Group Parameters for Receiver Group .............................................. 89
Group Parameters for Data Rate specific Receiver Group Subgroups90
Rx Jitter Tolerance Test (RSG-01 Gen1, RSG-02 Gen2, and RSG-03
91
4.6.4.1 Purpose .............................................................................. 92
4.6.4.2 Procedure ........................................................................... 92
4.6.4.3 Connection Diagram .......................................................... 93
4.6.4.4 Parameters ......................................................................... 94
4.6.4.5 Dependencies ..................................................................... 94
4.6.4.6 Results ................................................................................ 95
RSG-05 Receiver Stress Test at +350 ppm (for 1.5 Gbit/s) .............. 96
4.6.5.1 Purpose .............................................................................. 97
N5990A User Guide for SATA
Contents
4.6.6
4.6.7
4.6.8
4.6.9
4.6.10
4.6.11
5
Troubleshooting and Support ........................................................................................ 129
5.1
6
4.6.5.2 Procedure ........................................................................... 97
4.6.5.3 Connection Diagram .......................................................... 97
4.6.5.4 Parameters ......................................................................... 98
4.6.5.5 Dependencies ..................................................................... 98
4.6.5.6 Results ................................................................................ 98
RSG-06 Receiver Stress Test with SSC (for 1.5 Gbit/s) .................. 100
4.6.6.1 Purpose ............................................................................101
4.6.6.2 Procedure .........................................................................101
4.6.6.3 Connection Diagram ........................................................101
4.6.6.4 Parameters .......................................................................102
4.6.6.5 Dependencies ...................................................................102
4.6.6.6 Results ..............................................................................102
Rcvr Constant Parameter Stress Test ............................................. 104
4.6.7.1 Purpose ............................................................................104
4.6.7.2 Procedure .........................................................................105
4.6.7.3 Connection Diagram ........................................................105
4.6.7.4 Parameters .......................................................................105
4.6.7.5 Dependencies ...................................................................106
4.6.7.6 Results ..............................................................................106
Rcvr Jitter Tolerance Test................................................................ 108
4.6.8.1 Purpose ............................................................................109
4.6.8.2 Procedure .........................................................................109
4.6.8.3 Connection Diagram ........................................................111
4.6.8.4 Parameters .......................................................................111
4.6.8.5 Dependencies ...................................................................112
4.6.8.6 Results ..............................................................................113
Rcvr Sensitivity Test ........................................................................ 115
4.6.9.1 Purpose ............................................................................116
4.6.9.2 Procedure .........................................................................116
4.6.9.3 Connection Diagram ........................................................117
4.6.9.4 Parameters .......................................................................117
4.6.9.5 Results ..............................................................................117
Rcvr Data Rate Deviation Tolerance ............................................... 119
4.6.10.1 Purpose ..........................................................................120
4.6.10.2 Procedure .......................................................................121
4.6.10.3 Connection Diagram ......................................................121
4.6.10.4 Parameters .....................................................................122
4.6.10.5 Dependencies.................................................................122
4.6.10.6 Results ............................................................................122
Rcvr SSC Tolerance Test ................................................................. 124
4.6.11.1 Purpose ..........................................................................124
4.6.11.2 Procedure .......................................................................125
4.6.11.3 Connection Diagram ......................................................125
4.6.11.4 Parameters .....................................................................126
4.6.11.5 Dependencies.................................................................126
4.6.11.6 Results ............................................................................126
Log List and File.............................................................................................. 129
Appendix ........................................................................................................................ 131
6.1
Data Structure and Backup ............................................................................ 131
6.1.1
N5990A User Guide for SATA
ValiFrame Data Straucture .............................................................. 131
6.1.1.1 Images ..............................................................................131
7
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6.1.2
6.2
Remote Interface ............................................................................................ 134
6.2.1
6.2.2
6.2.3
6.2.4
6.3
6.3.6
Connect() ......................................................................................... 143
SetToDefault().................................................................................. 143
Init().................................................................................................. 143
GetParameterList() and GetParameterValues() ............................... 143
SetNextValue() ................................................................................. 143
6.3.5.1 Example ............................................................................144
Disconnect()..................................................................................... 144
IBerReader ...................................................................................................... 145
6.4.1
8
Introduction ..................................................................................... 134
Interface Description ....................................................................... 134
Using the Remote Interface............................................................. 136
Results Format ................................................................................ 139
Controlling Loop Parameters and Looping Over Selected Tests ................... 141
6.3.1
6.3.2
6.3.3
6.3.4
6.3.5
6.4
6.1.1.2 Settings ............................................................................132
6.1.1.3 Pattern..............................................................................132
6.1.1.4 Calibrations ......................................................................132
6.1.1.5 Tmp ..................................................................................132
ValiFrame Backup............................................................................ 133
IBerReader Interface ........................................................................ 147
N5990A User Guide for SATA
Introduction
1 Introduction
1.1 What’s in This Chapter
This chapter provides an introduction of this user guide.
1.1.1 Overview of This Guide
This guide provides a detailed description of the N5990A Test Automation Software
Platfom.
1.2 Document History
First Edition
(September, 2014)
Second Edition
(October, 2014)
N5990A User Guide for SATA
The first edition of this user guide describes functionality of software version N5990A
ValiFrame_2.23_SATA_2.20 or higher.
The second edition of this user guide describes functionality of software version
N5990A ValiFrame_2.23_SATA_2.20 or higher.
9
N5990A Overview
2 N5990A Overview
2.1 Test Automation Software Platform
The Keysight Technologies N5990A Test Automation Software Platform “ValiFrame” is
an open and flexible framework for automating tests such as electrical compliance
tests for SATA bus.
The product runs on a standard PC that controls a wide range of test
hardware. Typically, the hardware comprises of instruments for
stimulus and response tests such as pattern generators, bit errror
ratio testers (BERTs), and oscilloscopes. Key elements of the
software platform are a test sequencer, receiver test libraries, and
interfaces to oscilloscope applications for transmitter tests.
Additional options are available, e.g. User Programming.
N5990A is impemented in C# within the Microsoft .NET Framework.
The software platform is specified in the data sheet 5989-5483EN,
incl. the PC requirements. Application examples for SATA
are given in the application notes 5989-5500EN.
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Using Software
3 Using Software
3.1 Test Station Configuration
Test Station
Selection
The set of test instruments used for a specific application is referred to in the
following as "Test Station" or short "Station". The test station is controlled by a
suitable PC and the N5990A Test Automation Software Platform. At first, ValiFrame
Station Configuration
(Start > All Programs > BitifEye> <Application>) needs to be started prior to
“ValiFrame” (see Figure
3-1 and Figure 3-6).
When the ValiFrame Station Configuration is started, a window appears as shown in
Figure 3-2.
Figure 3-1: ValiFrame SATA Station Configuration Icon
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Figure 3-2: N5990A Station Selection Window
The available Test Stations are listed in a drop-down menu (highlighted in Figure
3-2). Multiple entries can be generated by User Programming (N5990A opt. 500) and
select the station to be used.
The N5990A Test Automation Software Platform supports the SATA
applications.
The N5990A primarily provides physical layer test automation.
The N5990A opt. 001 is the interface to SQL databases (and web browsers). In case
this option was purchased, the connection to the database application server is
established by unchecking the default "Database Offline" selection and entering the
IP address of the server. Proceed with “Next” or quit with “Cancel”. Pressing the
“Next” Button opens a ValiFrame Station Configuration window as given in Figure
3-3.
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Figure 3-3: N5990A Station Configuration Window
Test Station
Configuration
Depending on the selected application in Figure 3-2. The ValiFrame Station
Configuration window shows the instruments or instrument combinations that are
needed. All the required instruments can be selected using the drop-down menus
here and click on “Next” button to continue.
The user must ensure that all the selected instruments for the test station are
connected to the test station PC controller by remote control interfaces such as LAN,
USB, or GPIB.
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Using Software
Figure 3-4: N5990A Instrument Configuration Window
After all required instruments have been selected in Figure
3-3, those are listed in
the ValiFrame Instrument Configuration Window (Figure 3-4). In order to control
instruments for use with the test station, instrument connections need to be
established by using specific hardware addresses as described in the following
section. The "Mode" check box needs to be checked to set a specific instrument
status from "Offline" to "Online".
When starting a specific test station configuration for the first time, all instruments
are set to the “Offline” mode. In this mode the test automation software does not
connect to any instrument. This mode can be used for demonstrations or checks.
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3.1.1 Using Keysight IO VISA Connection Expert
Introduction
The Keysight IO VISA Connection Expert is recommended to setup new connections
or verify existing connections. Start the Connection Expert with a right-click on the
VISA icon in the task bar and select “Keysight Connection Expert”. A window popsup as shown in Figure
3-5.
Figure 3-5: Keysight IO VISA Connection Expert Window
Under “Instrument IO on this PC”, select “Refresh All” (highlighted in Figure 3-5). For
each instrument that is needed, verify that an entry exists in the list in this column
and that the icon for the instrument is green. The connection to instruments can be
verified by using the Keysight Visa Assistant, which is available in the same menu.
Once all the instruments to be used are listed properly, their address strings can be
entered in the ValiFrame Instrument Configuration Window (Figure 3-4). The
recommended way of doing this is by copying and pasting the instrument addresses
as follows:
Click on the “+” sign next to an instrument in the Connection Expert and its address
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will appear on a line below the instrument. Double click on this address and it will
appear in a box to the right. Copy the address, highlight the same instrument in the
Test Station Connection window, paste the address in the text field (highlighted in
Figure 3-4) and click “Apply Address”. Repeat this process for all instruments being
used, except the ParBERT and standard specific applications running on the
oscilloscope.
The applications running on the oscilloscope use a different technology to provide
remote access to ValiFrame, called .NET Remoting. Communication is only possible
using the LAN connection of the oscilloscope and for this reason the IP address
needs to be used with this type of instrument.
Enter the instrument address in the text field as shown in Figure 3-4 and press
“Apply Address” to set it. Once all the instruments are set with the appropriate
addresses that may be used, select the instruments that will be used by the Test
Automation Software by checking the tick box next to “Offline” in the “Mode” column.
Use the “Check Connections” button to verify that the instrument addresses are
valid.
Once you click the “Configure” button, the changes will be implemented and the Test
Station Configuration window will be closed.
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3.2 Starting Test Station
Start the ValiFrame test station with a double click on the icon on the desktop
(example for SATA test station given in Figure
station from “Start / All Programs / BitifEye”.
3-6). Alternatively, start the ValiFrame
Figure 3-6: ValiFrame SATA Test Station Icon
The ValiFrame N5990A will connect automatically to all instruments that are not set
to Offline mode in the Test Station Configuration (see Figure 3-4). It is ready for use
once all connections have been initialized successfully and the main menu will
appear as shown in Figure
N5990A User Guide for SATA
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3.2.1 Configuring DUT
Once the N5990A main menu appeared, the DUT needs to be configured in order to
proceed with testing. Click on the “Configure DUT” button in the tool bar or select
the “Configure DUT” option from the File menu (see Figure
appear as given in Figure
3-7). A window will
3-8.
Figure 3-7: ValiFrame Main Window
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N5990A User Guide for SATA
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Figure 3-8: Configure DUT Panel
The parameter selections available in the “Configure DUT” panel depend on the
specific application. Select all parameters which apply to the particular application to
configure the DUT. The selected DUT parameters and the information entered by the
user will be shown in the measurement reports. It is also stored with the
measurement data in case a connection to a SQL database exists. As this information
will be used to retrieve data from the database, select unique identifiers and
descriptions.
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In most applications either Compliance or Expert Mode must be selected. In
compliance mode the tests run according to the specific test specification (such as
SATA). In expert mode the DUT can be characterized to determine performance
margins. It is provided for advanced users and includes additional tests as well as
additional parameters to run tests differently than in compliance mode.
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3.2.2 Selecting, Modifying, & Running Tests
After the DUT has been configured, press the “OK” button in Configure DUT Panel.
The ValiFrame main window is displayed with the procedure tree as shown in Figure
3-9. It contains the list of calibration and test procedures, typically in the following
groups:
1. Calibration
2. Receiver tests
3. Transmitter tests
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Figure 3-9: M5990A Main Window with the Procedures
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Specific calibration or test procedures can appear multiple times as they might be
required for testing the DUT under various conditions. A typical example are multiple
data rates supported by the same DUT.
Use the “Properties” and “Log List” buttons of the main menu (highlighted in Figure
3-9) to display additional information on the right side and bottom of the ValiFrame
main window.
The parameter grid on the right side of the window shows the parameters which are
related to the selected calibration or test procedure subgroups or to individual
procedures, These parameters can only be set before the execution of the procedure
subgroup or procedure is started. The log list in the bottom of the window shows
calibration and test status messages (regular progress updates as well as warnings
and error messages).
3.2.2.1
System Calibration
It is necessary to calibrate the test system before running the first test, in order to
ensure that test results are consistent from run to run. Provided the equipment has
achieved thermal stability before the calibration is started (typically after 30 min of
warm-up), the thermal environment is stable, and no system elements have been
exchanged, the calibration is very stable and may only have to be repeated once a
week or even less frequently. The calibration interval depends on the degree of
accuracy desired. If the station is not calibrated prior to a DUT test, the results of the
previous calibration will be used for the current tests.
3.2.2.2
Selecting Procedures
The calibration, receiver, and transmitter test procedure groups can be selected
globally by clicking on the check box at the top of the group. Alternatively, an
individual test procedure can be selected by checking the specific selection boxes in
front of the tests. Only the test procedures which are selected will be executed.
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3.2.2.3
Modifying Parameters
Most calibration and test procedures as well as the groups containing them have
parameters that control the details of how the procedures are run. In compliance
mode most of these parameters are read-only. In expert mode almost all parameters
can be modified. First, select a specific calibration or test procedure or one of the
groups containing them in the ValiFrame procedure tree. The parameters should be
displayed in a property list on the right side of the screen. If they are not displayed,
press the “Properties” button. Depending on the user selection on the left side of the
top of the list, the list is either ordered alphabetically or in categories. The test
parameters available can be changed individually (see Figure 3-10). The test
parameters selected are listed in the MS Excel test results worksheets, see Figure
3-12.
Figure 3-10: Editing the Test Parameters
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3.2.2.4
Running Procedures
To run the selected procedure, press the “Start” button (see Figure 3-9). The
procedures are run in the order shown in the procedure selection tree. Some
procedures may require user interaction such as changing cable connections or
entering DUT parameters. The required action is prompted in pop-up dialog boxes
prior to the execution as shown in Figure
3-11.
Figure 3-11: Connection Diagram Pop-up Window
3.2.3 Results
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3.2.3.1
Run-Time Data Display
Most procedures generate data output. While the procedure is running, the data is
displayed in a temporary MS Excel worksheet, which opens automatically for each
individual procedure. An example is given in Figure
details about the file directories.
28
3-12 . See the Appendix for more
N5990A User Guide for SATA
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Figure 3-12: Result MS-Excel Worksheet Example
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The MS-Excel worksheet is opened during the procedure run and closed once the
specific procedure is finished. As long as the N5990A Software is running, each
worksheet can be reopened with a double-click on the respective procedure.
However, the individual worksheets will be lost when the N5990A main window is
closed, unless individual worksheets or a collection of them were saved by the user.
If a test or calibration procedure was run more than once, the list of results
is visible below the particular procedure after expanding the tree below the
procedure (see Figure 3-13).
Figure 3-13: Selecting the Repeated Procedure and Show Test Results
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3.2.3.2
MS-Excel Workbook
For user convenience, all individual worksheets are combined in a summary Excel
workbook at the end of the test run. The workbook must be saved explicitly (File >
Save Results as Workbook...) as shown in Figure 3-14, otherwise it will be lost! After
all tests have been run, a test report document can be generated additionally for
easy documentation and printing with the standard Print function of the File menu
(see Figure
3-14). An example test report for SATA is shown in Figure 3-15.
Figure 3-14: Save Results as Workbook
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Figure 3-15: Test Report Example
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3.2.3.3
Smiley's Representation
Once the selected procedures are run successfully, the smiley at the individual
procedure indicates the result (Pass / Fail / Incomplete) by displaying its face in
specific ways as given below (see Table 1).
Smiley
Description
It indicates that the procedure passed successfully at the previous run and the results are
available.
It indicates that the procedure passed successfully at the present run.
It indicates that the procedure was aborted/disturbed somehow and failed at the previous
run.
It indicates that the procedure was aborted/disturbed somehow and failed at the present
run.
It indicates that the procedure failed at the previous run.
It indicates that the procedure failed at the present run.
Generally this kind of smiley displays two results such as the first half indicates that the
result of the present run and the second half shows the result of the previous run. In this
example, the first half indicates that the procedure passed successfully at the present run
and the second half means that it was not completely run at the previous run.
Table 1: Smiley's Result Description Table
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3.3 Oscilloscope Transmitter Test Integration
Keysight Technologies provides a range of transmitter test applications for highspeed digital interfaces. The transmitter test applications run on real-time
oscilloscopes of the Keysight 90000 series such as a DSO (Digital Sampling
Oscilloscope). The transmitter test applications can be used stand-alone, without the
N5990A Test Automation Software Platform. For this use model, please refer to the
user documentation of the specific application.
The transmitter test applications however can be run through the N5990A Test
Automation Software Platform too. A remote interface is used to execute the
transmitter test procedures. For this model a test controller PC with the N5990A
software needs to be connected to the oscilloscope via Ethernet, e.g. through a LAN
switch.
3.3.1 Using the Software
In the N5990A Test Station Configuration, the available transmitter test applications
are listed as instruments (see Figure 3-16 for the example of SATA). The IP address
of the oscilloscope has to be used as the instrument address. After entering the
address, the transmitter test application instrument needs to be set to “Online” with
a click on its check-box. Push the “Check Connections” button to verify that the
connection works properly. If the transmitter test application is not already running
on the oscilloscope the N5990A Test Automation Software automatically starts it via
the oscilloscope firmware.
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Figure 3-16: Setting the TX Scope Application Online
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Using Software
For most applications, the Configure DUT dialog separates the test procedures for
transmitter and receiver test by selecting the device type (“Transmitter” or
“Receiver”). Select “Transmitter” for running the transmitter tests and vice versa. The
Configure DUT dialog shows the configuration parameters which apply to the SATA
application. The Configure DUT dialog allows to select the parameters as needed.
Figure 3-17: Configure DUT Dialog
The N5990A Main Window lists the transmitter tests in the test tree just like the
receiver tests, typically in a separate “Transmitter” group.
During the test run, the oscilloscope transmitter test application sends its connection
diagrams and pop-up dialog windows to the controller PC on which the N5990A Test
Automation Software is running. Once the oscilloscope application finished the test
run, the N5990A software will save the test results in a MS Excel worksheet which
includes screen shots, data graphs, data tables and specification limits similar to the
Rx test report. For SATA, the transmitter test application requires a special test
pattern for the analysis. N5990A controls the DUT directly or indirectly (through test
instruments) to configure the DUT for testing.
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3.3.2 Trouble Shooting
This section provides solutions for the following problems:
1. Wrong version of the transmitter test application
2. Error message at start-up and connection failures
3. Transmitter test application and oscilloscope seem to hang
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Using Software
3.3.2.1
Wrong version of the transmitter test application
When starting the transmitter tests, the N5990A software compares the version of
the transmitter test application which is currently installed on the oscilloscope with
the version which was tested with N5990A. In case the versions do not match, an
error message will appear in the N5990A log file and a warning dialog will show
details about the latest tested version. The appropriate version of the transmitter test
application should be installed on the oscilloscope to avoid problems. Even if the
versions do not match, the N5990A Test Automation Software can try to run the
transmitter tests. This may work if the changes between the transmitter test
application versions are small, but installing the officially supported version is always
strongly recommended.
3.3.2.2
Error message at start-up and connection fails
The connection to the transmitter test application must be established through
Ethernet (LAN), however the firewall settings might not be set properly on the
oscilloscope or the controller PC. This might result in error messages when the
N5990A Test Automation Software tries to start the oscilloscope transmitter test
application. In this case, check whether the following applications are added to the
firewall exception list:
1. Transmitter test application on the oscilloscope
2. N5990A Test Automation Software and N5990A Station Configuration on
the controller PC
In case the controller PC has more than one LAN adapter, the .Net remoting back
channel which displays the dialogs may not work and the oscilloscope application
may try to open the remoting back channel to an invalid address. To recover from
this, the LAN adapter which is connected to the oscilloscope should be set to be the
primary adapter. This might require help from a network administrator as the specific
setting depends on the Windows version.
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If the connection and information dialogs from the oscilloscope are not displayed
properly, check the firewall settings first and then make sure that the LAN adapter
connected to the oscilloscope network is set to the primary one.
3.3.2.3
Transmitter test application and oscilloscope seem to hang
In general the transmitter test application expects a valid signal that can be used as
a trigger for the sampling but sometimes the signal is missing or too small, i.e. below
the threshold.In this case the oscilloscope may appear to be frozen. This is expected
oscilloscope behavior because the oscilloscope trigger hardware stops the execution
of oscilloscope firmware as long as the trigger signal is missing. To exit from this
state, apply a valid signal or reboot the oscilloscope and restart the N5990A software
to check the signals before starting transmitter tests if the required trigger signal is
unknown. Please report the test and test conditions to [email protected]
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4 SATA Computer Bus
Test Application
4.1 Introduction
This chapter describes the calibrations and test procedures conducted by
N5990A ValiFrame for SATA (Serial Advanced Technology Attachment) in
detail. The N5990A software implements the RSG (Receiver Signal
Requirements) tests according to the UTD (Unified Test Document)
specification and also offers some custom characterization tests to provide
more details on DUT behavior beyond the limits. The RSG tests are
conducted to verify that the receiver can handle maximum stress signals
according to the specification. Figure 4-1 illustrates a connection diagram for
the SATA Receiver Test Set-up.
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Figure 4-1: Example for SATA Receiver Test Setup
The N5990A Test Automation software supports the Keysight Technologies
Electrical Performance and Compliance Test Software N5411B for the SATA
Transmitter tests. A DSO (Digital Storage Oscilloscope) is required for
running N5411B software. Refer to Keysight N5411B SATA Compliance Test
Software data sheet for information about the supported models.
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4.2 Supported Hardware Configurations
ValiFrame N5990A SATA supports a range of hardware configurations based
on the Keysight J-BERT N4903B and Keysight J-BERT M8020A highperformance serial BERTs (Bit Error Ratio Testers) and an Infiniium
oscilloscope. The 90000 model oscilloscope is recommended, but the 80000
oscilloscope model is also supported for backwards compatibility.
4.3 ValiFrame SATA Station
4.3.1 ValiFrame SATA Station Configuration
Refer to the ValiFrame “N5990A_Getting_Started_SATA.pdf” for instructions
on how to install and start the ValiFrame Test Automation software
platform. After the software has been installed, an icon is added to the
desktop as shown in Figure 4-2. Start the software with a double-click of the
left mouse button or, alternatively, start the application from “All Programs
> BitifEye > SATA > ValiFrame SATA Station Configuration”
Figure 4-2: SATA Station Configuration Icon
When the software is started, a window appears as shown in Figure 4-3. It
allows the “SATA station” to be selected.
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Figure 4-3: SATA Station Selection Window
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To use the database connection for ValiFrame SATA, uncheck the
“Database Offline” check box and the “Application Server” text box is
enabled to enter the database server IP (Internet Protocol) address (see
Figure 4-3). After the SATA station has been selected, press “Next” button
to continue. A window pops up as shown in Figure 4-4.
Figure 4-4: SATA Station Configuration Window
The ValiFrame SATA Station Configuration Window (Figure 4-4) allows the
required instruments for SATA testing to be selected. It contains the
following options:
1. Data Generator
2. Error Detector
3. Rx BIST Control (Receiver Built-In Self-Test Control)
4. Tx BIST Control (Transmitter Built-In Self-Test Control)
5. Power Switch
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4.3.1.1
Data Generator
The data generator has two functions. It can train the DUT (Device Under
Test) into a special loopback test mode (BIST-L). It is also used to sends a
stressed test signal into the DUT when it is in the lopback mode. It can be
selected as:
 JBERT M8020A
 JBERT B
4.3.1.2
Error Detector
The error detector checks if the data looped back from the DUT (Device
Under Test) contains errors. It can be selected as:
 JBERT M8020A
 JBERT B
 Serial Tek BusXpert
 Custom DLL
4.3.1.3
Rx BIST Control
The Rx BIST control moves the DUT into loopback mode to perform the
tests. Typically this is a J-BERT with the second channel option. If the
second channel option is not available or the DUT needs some special
handling to go into loopback, there is the possibility of choosing a customerspecific loopback activation method either manually or with a custom DLL to
integrate it into ValiFrame.
This option can be selected as:
 Automated
 Manual
 Manual With Data Generator (for setting the data generator up like
in automated mode, but giving the user full control otherwise)
 Custom DLL
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4.3.1.4
Tx BIST Control
Owing to the method of implementing the transmitter tests (by integrating
tests running in a separate application on the oscilloscope that sometimes
tries to take control of the JBERT), the Tx BIST control options are limited
to:
 Automated
 Manual
 Custom DLL
4.3.1.5
Power Switch
This power switch has the following options:
 Manual
 NetIo230B
 SynaccessNP
If it is chosen as Manual, the user needs to power cycle the DUT manually
and the options for Power Switch Automation (see Figure 4-9) such as
Channel, Off-On Duration, and Settling Time are disabled. When it is
selected as NetIo230B or SynaccessNP, the Power Switch Automation is
enabled to select the related parameters and the DUT is power cycled
automatically.
After the SATA configuration has been selected, press the “Next” button to
continue. A window pops up as shown in Figure 4-5.
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Figure 4-5: SATA Instrument Configuration Window
After the installation process, all instruments are configured by default in
“Offline” mode. In this simulation mode, hardware does not need to be
physically connected to the test controller PC. ValiFrame cannot connect to
any instrument in this mode. In order to control the instruments that are
connected to the PC, the instrument address must be entered in the text box
shown in Figure 4-5. The address depends on the bus type that is used for
the connection, for example, GPIB (General Purpose Interface Bus) or LAN
(Local Area Network). Most of the instruments used in the SATA station use
a VISA (Virtual Instrument Software Architecture) connection. To determine
the VISA address, run the “VISA Connection Expert” (right-click on the VISA
icon in the task bar and then select the first entry “Keysight Connection
Expert”). Enter the instrument addresses in the “Station Configuration
Wizard”, for example, by copying and pasting the address strings from the
Connection Expert entries. After the address strings have been entered,
remove the “Offline” flag for all instruments needed and then press the
button “Check Connections” to verify that the connections for the
instruments are established properly.
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4.3.2 Starting ValiFrame SATA Station
Start the ValiFrame SATA station with a double click on the “ValiFrame
SATA” icon that appears on the desktop as shown in Figure 4-6.
Alternatively, start the ValiFrame SATA Station from “Start > All Programs
> BitifEye > SATA > ValiFrame SATA”. Starting the ValiFrame SATA
station opens the window shown in Figure 4-7.
Figure 4-6: ValiFrame SATA Icon
Figure 4-7: ValiFrame SATA User Interface
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4.3.3 Configuring the DUT
The DUT needs to be configured before any calibration or test procedure is
run. Pressing the “Configure DUT” button in Figure 4-7 displays a window
Figure 4-8.
Figure 4-8: Configure DUT Panel with and without Database Connection
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If the database option is selected in the ValiFrame SATA Station
Configuration window (see Figure 4-3), the Configure DUT panel appears as
shown in Figure 4-8. To configure the DUT with database connection, enter
values (any) for “Product Number”, “Serial Number”, and “Product ID”.
Then, click on the “Register Product” button to register the database
connection with the provided values. Clicking on the “Register Product”
button, enables the button “OK”. With a click on the “OK” button, the DUT
is configured with the selected parameters. The procedures run with the
database settings are stored at ValiFrame Webviewer and those can be
viewed by selecting the “Product Number” and “Serial Number” (these
values should be same as the provided values in Figure 4-8.
4.3.3.1
DUT Parameters
In Figure 4-8, the DUT parameters, such as DUT type, Data Rate, Spec
Version, and compliance mode or expert mode, can be selected. The DUT
Parameters are listed in Table 2.
Parameter Name
Parameter Description
DUT
DUT Name
Name of the DUT.
Serial Number
Serial number of the DUT.
DUT Type
This can be selected as:


Data Rate
These two types can be tested according to the
versions UTD 1.2, 1.3, 1.4, 1.4.2, and UTD 1.4.3. and also
have different specification limits and default BIST
activation settings.
The value can be selected as:



Spec Vers.
N5990A User Guide for SATA
Device
Host
1.5 Gbit/s
3.0 Gbit/s
6.0 Gbit/s
The available versions are:
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UTD 1.2, 1.3, 1.4, 1.4.2, UTD 1.4.3 and 1.5.
Interface
Description
This can be “i” (internal), “m” (external) or “u”. “i” and
“m” use different spec limits but are identical
otherwise. “u” has a special calibration procedure for
gen3 hosts.
Description of the DUT.
Test
User Name
User name text field.
Comment
Text field for user comments.
Initial Start
Time stamp of the start of the current test session.
Last Test
Time stamp of the last test conducted in the current
session.
Tests are conducted as mandated by the UTD. Most
parameters shown in the calibration and test
procedures are in read-only mode; they cannot be
modified by the user.
Calibrations and tests can be conducted beyond the
limits and constraints of the UTD. The parameters are
shown in the calibration and test procedures; they can
be modified by the user.
Additional characterization tests are available.
This button enables some additional options (see 2.3.2
section) to be selected.
Compliance Mode
Expert Mode
Edit Parameters
Table 2: DUT Parameter List
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4.3.3.2
Edit Parameters
A click on the “Edit Parameters” button in Figure 4-8 pops-up a window
(Figure 4-9) and the parameters in SATA Edit Parameters Panel are listed in
Table 3.
Figure 4-9: SATA Edit Parameters Panel
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Parameter Name
Parameter Description
Loopback Training
Use Switch
Maximum Retries for BIST
Training
When the “Use Switch” option is selected, it adds two
switches to the hardware setup to alternate
connections quickly between a separate BIST
activation tool and the data generator/error detector.
This option is only available when BIST initiation mode
is set to “Manual” or “Custom DLL”.
This is the maximum number of loopback training
retries. If all retries fail the following test will be
considered as failed.
Power Switch Automation
Use power switch
automation
Channel
Off – On delay (ms)
Settling time (ms)
Loopback Training dropdown selection
Use Trigger
54
This checkbox controls if a remote controllable power
switch is used for power cycling the DUT. If this is
unchecked the remaining options related to it (Channel,
Off-On delay and Settling time) are disabled.
This sets the channel number of the power switch
channel which is connected to the DUT.
This is the duration between turning the DUT off and
then turning it on again.
This is the wait time after the DUT is turned on and
before the test continues with loopback training.
This drop-down selection is used to control how
loopback training is done. It is disabled when “BIST
Control” is set to “Manual” or “Custom DLL”. The
default value is “Automatic”. In “Automatic” mode
ValiFrame uses internally created sequences for
loopback training. In “Custom” mode the user sets a
path to a directory containing custom loopback training
sequences, typically created with the SATA Link
Training Suite. In “Legacy” mode old sequences
imported from jbistgui can be used. “Legacy” mode is
only available when the data generator is set to
“JBERT B”.
This checkbox controls if a trigger from the DUT to the
J-BERT is used during loopback training. Most DUTs
work without a trigger, so this is disabled by default. It
is only available for hosts.
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Legacy Sequence
Manage Sequences
Refer to Manage Sequences for a detailed explanation.
DUT Behavior
DUT transmits with SSC
DUT uses protocol
loopback
For receiver tests this setting is used to optimize the
error detector CDR unit setup.
For transmitter tests is controls which tests are
available. When the “DUT transmits with SSC” is
enabled, the transmitter tests related to SSC are
available. If it is disabled, a “long-term frequency
stability” test is available instead.
If this option is selected, the J-BERT error detector
ignores all SATA primitives instead of only ALIGN
primitives. Some DUTs add additional primitives other
than ALIGN pairs to the data during loopback. This
behavior is not compliant with the SATA specification,
so this option is disabled by default.
Data Generator
Ignore voltage limits
Choosing this option makes it possible to set voltage
levels higher than the specified limits. This should be
used only if it is absolutely needed. If this option is
used unnecessarily, it may damage or even destroy the
DUT if it is not designed to tolerate high voltage levels.
De-Emphasis
Use de-emphasis
This checkbox controls if de-emphasis will be applied to
the test signal. Checking it also adds a de-emphasis
calibration procedure and parameters to set the desired
de-emphasis during tests. This is not required by the
SATA specification or UTD. This selection is available
for customer convenience.
De-Emphasis
The calibrated de-emphasis for non-transition bits at
the TP2 test point.
Error Detector
Use full auto align
N5990A User Guide for SATA
The "Use full auto align" checkbox forces using
AutoAlign on the error detector every time the sample
point is adjusted. Without it TimeCenter is used
instead.
TimeCenter is a lot faster than AutoAlign. When the
DUT transmits a good signal both work equally well.
Forcing AutoAlign is useful for testing DUTs that
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transmit a signal with a deformed eye shape or not
properly centered around 0 V.
InfiniiSim
Rx Calibration Settings
Tx Test Settings
Opens a window where the user can control embedding
of a custom channel during receiver calibration by
setting paths to .tf4 files.
Opens a window where the user can control embedding
of a custom channel during transmitter tests. It is a
direct mapping of the options available in the
transmitter test app.
Table 3: SATA Edit Parameter List
4.3.3.2.1
Manage Sequences
The manage sequence button is only available in Legacy mode. It is used for
importing and managing loopback training sequences based on the external
“jbistgui” tool available from The University of New Hampshire
InterOperability Laboratory. Importing sequences is only needed when the
defaults for J-BERT based loopback activation do not work with a DUT.
Clicking on the “Manage Sequences” button displays a window as shown in
Figure 4-10. To import a sequence, first create the J-BERT setting that can
put the DUT into loopback setup using the “jbistgui” software. Then follow
the instructions given in the Manage BIST Training Sequences Panel.
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Figure 4-10: Manage BIST Training Sequences Panel
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4.4 Calibration and Test Procedures
During the execution of all calibration and test procedures, the results are
displayed automatically in a MS Excel worksheet graphically as well as in a
data table. Once a specific calibration or test procedure is finished, the MS
Excel worksheet is closed. To re-open it at any time, double click on the
respective procedure. All calibration and test data worksheets can be saved
in a workbook by selecting “File > Save Results as Workbook...” at any time.
It is recommended that this step is carried out at least at the end of each
ValiFrame run. If the calibration and test procedures are conducted during
the same ValiFrame run, the calibration and test result worksheets are
combined in the workbook. If a test procedure is conducted without prior
execution of calibration procedures in the same test run, only the test
results will be saved to the workbook. As a safety feature, all calibration and
test procedure results are saved by default to the ValiFrame “Tmp”
directory. In addition to the calibration data worksheets, the calibration data
files are also generated. These files are saved by default to the ValiFrame
calibrations folder (refer to “N5990A_Getting_Started_SATA.pdf”).
4.4.1 Example for Calibration and Test Procedure
All calibration and test procedures are included in the respective groups
such as “Calibration”, “Receiver”, “Transmitter”, and “OOB”. For most of
the calibration and test procedures, some specific parameters can be set in
expert mode by the user. In Figure 4-11 the “1.5 Gbit/s Random Jitter
Calibration” procedure is highlighted as an example and the respective
calibration parameters are shown on the right-hand side of the ValiFrame
user interface. This is achieved by clicking on the calibration name. To start
the calibration or test procedure, check the box corresponding to the
selected procedure. Then the “Start” button is enabled and colored green.
Pressing the “Start” button runs the calibration/test.
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Figure 4-11: Example for SATA Calibration and Test Procedure
Before executing any calibration or test procedures, ensure that the SATA
Station Configuration is conducted properly with all necessary instruments
such as the Infiniium oscilloscope and J-BERT set to “online”. All procedures
can be run in offline mode, that is without any instrument connected. The
offline mode is intended for product demonstrations with simulated data.
CALIBRATIONS RUN IN OFFLINE MODE DO NOT GENERATE VALID
CALIBRATION DATA. TESTS RUN IN OFFLINE MODE DO NOT PRODUCE
VALID RESULTS.
4.4.2 Connection Diagram
The connection diagram is displayed by right-clicking on the desired test or
calibration and selecting “Show Connection” as shown in Figure 4-12.
Alternatively, the connection diagram is displayed automatically on starting
the selected test or calibration.
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Figure 4-12: Show Connection Diagram
The connection diagram changes according to the options selected in the
Edit Parameters window (Figure 4-9), such as “Use Switch” and “Use deemphasis”. Once the selected procedures are run successfully, the
individual procedures display the result by representing the smiley in
different styles such as given below (see Table 4: Smiley's Result
Description Table).
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Smiley
Description
It indicates that the procedure passed successfully at the previous run and
the results are available.
It indicates that the procedure passed successfully at the last run
It indicates that the procedure was aborted/disturbed somehow and failed at
the previous run.
It indicates that the procedure was aborted/disturbed somehow and failed at
the last run.
It indicates that the procedure failed at the previous run.
It indicates that the procedure failed at the last run.
Generally this kind of smiley indicates two results such as the first half
indicates that the result of the last run and the second half shows the result
of the previous run. In this example, the first half indicates that the
procedure passed successfully at the last run and the second half represents
that the procedure was not completely run at the previous run.
Table 4: Smiley's Result Description Table
4.4.3 SATA Parameters Types
The SATA parameters are categorized as:
1. Sequencer Parameters
2. Group Parameters
3. Procedure Parameters
All these types of parameters are explained in the following sections.
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4.4.3.1
Sequencer Parameters
The sequencer parameters control the flow of the test sequencer, not the
behavior of individual procedures. They are identical across all versions of
ValiFrame. One of them, Repetitions, is available for all procedures and
groups in the procedure tree. The others are only available for procedures.
Like all other parameters the sequencer parameters are shown on the right
side of the ValiFrame user interface and they can be changed by the user.
Which parameters are visible depends on the selected element in the
procedure tree on the left side of the user interface. In Figure 4-11, the 1.5
Gbit/s Random Jitter Calibration is highlighted as an example. All sequencer
parameters are listed in alphabetical order in Table 5.
Parameter Name
Parameter Description
Procedure Error Case
Behavior
“Proceed With Next Procedure” or “Abort Sequence”,
selects what will happen if an error happens during
the procedure. Error in this context is defined as
something outside of the scope of what the procedure
is supposed to do normally that prevents it from
running.
“Proceed With Next Procedure” or “Abort Sequence”,
selects what will happen if the procedure fails. For
calibrations failing in this context means the
measured data is inconsistent or indicates that
compliant testing is not possible with the used
hardware. For tests failing means the test finished
properly but the DUT did not pass.
The number of times the group or procedure is going
to be repeated. If the value is '0', it runs only once.
Procedure Failed Case
Behavior
Repetitions
Table 5: SATA Sequencer Parameters
4.4.3.2
Group Parameters
The group parameters are used for several related calibration or test
procedures. They are shown on the right side of the ValiFrame user interface
when the selected entry of the procedure tree on the left is a group instead
of an individual procedure as shown in Figure 4-13.
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Figure 4-13: SATA Common Parameters
4.4.3.3
Procedure Parameters
The Procedure Parameters are all parameters that do not fall into one of the
previously described categories. They are shown on the right side of the
ValiFrame user interface when the selected entry of the procedure tree on
the left is an individual procedure. They only change the behavior of that
single procedure. Procedures often have parameters with the same name,
but set settings always only apply on a per procedure basis. The meaning
may be slightly different depending on the procedure. These parameters are
listed in the chapters of the procedure they belong to.
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4.5 SATA Calibration Procedures
4.5.1 Calibration Overview
Before any receiver test procedure can be run, the SATA receiver test
system must be calibrated. The ValiFrame calibration plane is given by the
DUT input ports. The receiver test signal characteristics such as the SATA
signal generator output voltage level and jitter parameters are typically
affected by the signal transmission between the generator output ports and
the DUT input ports. Thus for any signal output parameter selected by the
user (set value), the jitter and the signal received at the DUT input ports
(actual value) deviate from the set value. Additional deviations can be
caused by effects such as offset errors, hysteresis, and nonlinear behavior of
the signal generator. The ValiFrame calibration procedures measure these
deviations so they can be compensated in the test procedures. All
calibration procedures required for SATA receiver testing are included in the
ValiFrame software. The ValiFrame calibration procedures are implemented
such that the calibration process is conducted as fast as possible and is
automated as much as possible, for example, by minimizing the number of
reconfigurations of the hardware connections.
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4.5.2 Group Parameters for Calibration
The parameters for the calibration group are listed in Table 6.
Parameter Name
Parameter Description
Embed Custom Channel
Controls if a custom channel is embedded during
calibrations.
This shows the path to the transfer function file
containing the standard CIC definition for gen3 UHost
calibrations. Only visible if Embed Custom Channel is
false. Read-only.
This is the path to a user-created custom transfer
function file that will be embedded during calibrations
(all expect for gen3 UHost). Only available if Embed
Custom Channel is true.
This is the path to a user-created custom transfer
function file that will be embedded during gen3 UHost
calibrations. It should contain a transfer function
definition that is equivalent to adding the custom
channel definition and the standard CIC definition.
Only available if Embed Custom Channel is true.
CIC Transfer Function File
Custom Channel Transfer
Function FIle
Custom Channel + CIC
Transfer Function File
Table 6: SATA Group Parameters for Calibration Procedures
4.5.3 De-Emphasis Calibration
The De-Emphasis Calibration procedure is available for all data rates when
the “Use de-emphasis” check box is checked in SATA Edit Parameters
Panel (see Figure 4-9: SATA Edit Parameters Panel).
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Figure 4-14: De-Emphasis Calibration
4.5.3.1
Purpose
This procedure calibrates the de-emphasis.
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4.5.3.2
Procedure
The pattern generator sends a Framed COMP pattern to the oscilloscope.Deemphasis is applied to the data signal over several steps. The set deemphasis value starts with a value defined by the “Start De-Emphasis”
property (default 12 dB). The de-emphasis value is increased in linear steps.
At each step, the resulting de-emphasis value is measured using the
oscilloscope. The results are stored in pairs of set and measured values.
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4.5.3.3
Connection Diagram
Figure 4-15: Connection Diagram for De-Emphasis Calibration
4.5.3.4
Parameters
Parameter Name
Parameter Description
Start De-Emphasis
This is the initial de-emphasis value set for the
calibration.
Table 7: SATA Parameters for De-Emphasis Calibration
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4.5.3.5
Dependencies
No calibration is required for this procedure.
4.5.3.6
Results
An example MS-Excel worksheet for the De-Emphasis Calibration procedure
is shown in Figure 4-16: MS-Excel Worksheet for De-Emphasis Calibration.
The result sheet contains the following data:
 A calibration data graph
 A parameter list
 A calibration data table (refer to Table 8)
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Figure 4-16: MS-Excel Worksheet for De-Emphasis Calibration
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Parameter Name
Parameter Description
Set De-Emphasis
This is the de-emphasis value set in the instrument.
Measured DeEmphasis
This is the de-emphasis value measured at the test point.
Table 8: De-Emphasis Calibration Data Table
4.5.4 Random Jitter Calibration
The Random Jitter Calibration procedure is available for all data rates
Figure 4-17: Random Jitter Calibration
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4.5.4.1
Purpose
This procedure calibrates random jitter.
4.5.4.2
Procedure
The pattern generator sends the mid-frequency test pattern (MFTP) to the
oscilloscope. Random jitter is added to the data signal. The set RJ value
starts at 0 mUI and is increased in linear steps using the “Jitter Step Size”
value until the value of “Stop Jitter” is reached. At each set value, the
resulting RJ amplitude is measured using the RJ/DJ-separation software
(EZJIT Plus) on the oscilloscope. The results are stored in pairs of set and
measured values.
4.5.4.3
Connection Diagram
Refer to Figure 4-18 for the connection diagram.
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Figure 4-18: Connection Diagram for Random Jitter Calibration
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4.5.4.4
Parameters
Parameter Name
Parameter Description
Transitions
The number of transitions (0 to 1 or 1 to 0) used for the jitter
measurement.
This is the final jitter value for the calibration procedure.
Stop Jitter
Jitter Step Size
De-Emphasis
The difference value of set jitter between two jitter
measurements.
The de-emphasis for the non-transition bits used during
calibration. Read-only.
Table 9: SATA Parameters for Random Jitter Calibration Table
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4.5.4.5
Dependencies
No calibration is required for this method.
4.5.4.6
Results
An example MS-Excel worksheet for the Random Jitter Calibration
procedure is shown in Figure 4-19. The result sheet contains the following
data:
 A calibration data graph
 A parameter list
 A calibration data table (refer to Table 10)
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Figure 4-19: Example MS-Excel Worksheet for Random Jitter Calibration
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Parameter Name
Parameter Description
Set Jitter
This is the jitter amplitude value set in the instrument.
Measured Jitter
This is the jitter amplitude value measured at the test
point.
Table 10: Random Jitter Calibration Data Table
4.5.5 Sinusoidal Jitter Calibration
This Sinusoidal Jitter Calibration is available for all data rates.
Figure 4-20: Sinusoidal Jitter Calibration
4.5.5.1
Purpose
This procedure calibrates the SJ value.
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4.5.5.2
Procedure
The pattern generator sends the mid-frequency test pattern (MFTP) to the
oscilloscope. Sinusoidal jitter is applied to the data signal. The procedure
uses up to eight SJ frequencies between 0 MHz and the value of “Max Jitter
Frequency”. The set SJ amplitude starts at 0 mUI and is increased in linear
steps using the value of “Jitter Step Size” until the “Stop Jitter” value is
reached. The calibration procedure iterates through all frequencies for each
set amplitude value before proceding to the next amplitude value. The
resulting SJ values at the test point are measured with the RJ/DJseparation software (EZJIT Plus Software) on the oscilloscope. The results
are stored in sets of one set jitter amplitude value and one resulting jitter
amplitude value per frequency.
4.5.5.3
Connection Diagram
The connection diagram is as shown in Figure 4-18.
4.5.5.4
Parameters
Parameter Name
Parameter Description
Transitions
The number of transitions (0 to 1 or 1 to 0) used for the jitter
measurement.
This is the final jitter value for the calibration procedure.
Stop Jitter
Jitter Step Size
Max Jitter
Frequency
De-Emphasis
The difference value of set jitter between two jitter
measurements.
The highest frequency that is calibrated.
The de-emphasis for the non-transition bits used during
calibration. Read-only.
Table 11: SATA Parameters for Sinusoidal Jitter Calibration Table
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4.5.5.5
Dependencies
Versions below UTD 1.4 use the Random Jitter Calibration for this
procedure. The remaining versions (≥ UTD 1.4) do not require any
calibration.
4.5.5.6
Results
An example MS-Excel worksheet for the Sinusoidal Jitter Calibration
procedure is shown in Figure 4-21.
The result sheet contains the following data:
 A calibration data graph
 A parameter list
 A calibration data table
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Figure 4-21: Example MS-Excel Worksheet for Sinusoidal Jitter Calibration
Parameter Name
Parameter Description
Set Jitter
This is the sinusoidal jitter amplitude value set in the
instrument.
This is the sinusoidal jitter amplitude value measured
at the test point for the frequency listed in the column
caption.
Sinusoidal Jitter (X MHz)
Table 12: Sinusoidal Jitter Calibration Data Table
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4.5.6 Differential Voltage Calibration
This Differential Voltage Calibration is available for all data rates.
Figure 4-22: Differential Voltage Calibration
4.5.6.1
Purpose
This procedure calibrates the differential voltage.
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4.5.6.2
Procedure
The method for the Differential Voltage Calibration changes depending on
the selected UTD version (see Figure 4-8). The basic principle of this
procedure is that the pattern generator sends a pattern to the real-time
oscilloscope. The set differential voltage value is increases over four linear
steps. At each step, the oscilloscope measures the resulting differential
voltage value. The results are stored in pairs of set and measured values.
4.5.6.2.1
Patterns
For the Framed COMP pattern a lone bit pattern (LBP) is used. This pattern
contains the following:
1. Five ‘0’s followed by one ‘1’ (1000001, lone ‘1’)
2. Five ‘1’s followed by one ‘0’ (0111110, lone ‘0’)
The lone bit has the lowest differential amplitude that can occur during the
transmission of valid 10-bit SATA symbols. For the calibration procedure,
either the full Framed COMP pattern or the LBP can be used.
4.5.6.2.2
Signal stress
The calibration can be done with or without inter-symbol interference (ISI),
RJ, and SJ.
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4.5.6.2.3
Measurement methods

Lone bit amplitude
The oscilloscope is triggered to find the measured values of the lone
bit and the amplitude of the bit.

Extrapolated eye opening
The inner eye height is measured with a histogram and extrapolated
to the required bit error rate (BER).

Fixed length eye opening
The inner eye height is measured over 5 E-6 UI.
Version
Pattern
Signal Stress
Measurement Method
≤ UTD 1.3
Framed COMP
No
Lone Bit Amplitude
UTD 1.4
Framed COMP
Yes
UTD 1.4.2
LBP
Yes
UTD 1.4.3
Framed COMP
Yes
Extrapolated Eye
Opening
Fixed Length Eye
Opening
Fixed Length Eye
Opening with narrow
histogram
Table 13: Pattern, Signal Stress, and Measurement Method Details of UTD Versions Table
4.5.6.3
Connection Diagram
The connection diagram is as shown in Figure 4-18.
4.5.6.4
Parameters
Parameter Name
Parameter Description
De-Emphasis
The de-emphasis for the non-transition bits used during
calibration. Read-only.
Table 14: SATA Parameters for Differential Voltage Calibration
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4.5.6.5
Dependencies
No calibration is required for this procedure.
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4.5.6.6
Results
An example MS-Excel worksheet for the Differential Voltage Calibration
procedure is shown in Figure 4-23. The result sheet contains the following
data:
 A calibration data graph
 A parameter list
 A calibration data table (refer to Table 15)
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Figure 4-23: Example MS-Excel Worksheet for Differential Voltage Calibration
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Parameter Name
Parameter Description
Set Voltage
This is the differential voltage (peak–peak) set at the
data generator.
This is the differential voltage value measured at the
test point.
Measured Voltage
Table 15: Differential Voltage Calibration Data Table
4.6 Receiver Test Procedures
The basic principle of all SATA receiver tests (Figure 4-24) is as follows:
 Train the DUT into the Far End Re-timed Loopback Mode (BIST-L)
 Send the Framed COMP pattern with defined stress characteristics
 Use the error detector to verify that the DUT loops back the correct
pattern without errors
This is how a single point of data is taken. Most tests will then continue to
change the signal stress to collect more data. If the DUT leaves the
loopback mode the test will try to re-initialize it.
If calibration data is available it will be used to make sure the signal stress
is at the correct level at the test point it is defined for. If the calibration data
is missing a warning message pops up. When the user explicitly ignores the
warning the tests can be run without the calibration data.
For Rx tests, the real-time oscilloscope is not needed.
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Figure 4-24: SATA Receiver Test Groups and Common Parameters
4.6.1 Dependencies for All Receiver Tests
All receiver tests use the same calibration data. The De-Emphasis
Calibration is only used when “Use de-emphasis” is enabled (see Figure
4-9). Apart from that, all receiver tests use all calibrations.
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4.6.2 Group Parameters for Receiver Group
The common parameters for the receiver test group are listed in Table 16.
Parameter Name
Parameter Description
Data Generator
Number of aligns in
Framed COMP pattern
De-Emphasis
This is the number of ALIGN primitives in each ALIGN
block in the test pattern used for receiver tests. This
setting has no effect on the part of the training
sequence before the looped test pattern.
This is the de-emphasis value for the non-transition
bits used during receiver tests. Read-only.
Error Detector
Recovery Time
Use full AutoAlign
Data Rate Mode
This is the time after the loopback training or changing
signal stress the DUT is allowed to settle. Errors
during this time are ignored.
This parameter controls how centering the sample
point in the error detector is done. If it is “true” a full
AutoAlign is used. If it is “false” TimeCenter is used
instead. TimeCenter is a lot faster than AutoAlign, but
AutoAlign is better at compensating for non-ideal DUT
transmitter signals.
This parameter controls how the BusXpert error
detector selects its data rate. It has two options,
‘Specific’ and ‘Automatic’. If it is set to “Specific” the
BusXpert is set up to expect the specific data rate at
which the procedure is running. If it is set to
“Automatic” the BusXpert is set up to find the correct
data rate automatically.This parameter is only
available if a BusXpert is selected as the error
detector.
BIST Training
Force Retraining
Always Power Cycle
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When this parameter is “true”, a new loopback
training is always done when the SJ frequency
changed.
When this parameter is “true”, a power cycle is done
before starting loopback training. When it is set to
“false” the first attempt is done without a power
cycle. Loopback training retries always start with a
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power cycle.
Loopback Training Max
Retries
BIST Activation Sequence
This is the maximum number of retries to train the
DUT into loopback mode.
This parameter displays the BIST sequence type
selected using the sequence drop-down menu in the
Edit Parameters window (see Table 3 for details).
Read-only.
Power Switch Automation
Use Power Switch
Automation
Power Switch Channel
Number
Power Cycle Off-On Delay
Power Cycle Settling Time
This parameter controls if a remote controllable power
switch is used for power cycling the DUT. If it is
“false”, all following parameters (Power Switch
Channel Number, Off-On delay, Settling Time) are
disabled.
This sets the channel number of the power switch
channel which is connected to the DUT.
This is the duration between turning the DUT off and
then turning it on again.
This is the wait time after the DUT is turned on and
before the test continues with loopback training.
Table 16: Receiver Tests Group Common Parameter List
4.6.3 Group Parameters for Data Rate specific Receiver Group Subgroups
Parameter Name
Parameter Description
Error Detector
CDR Bandwidth
CDR Peaking
Transition
Density
This is the loop bandwidth of the error detector clock data
recovery (CDR) unit.
This is the loop bandwidth of the error detector clock data
recovery (CDR) unit. It can be set to “low”, “medium” or
“high”.
This is the expected transition density at the error detector
used to optimize the internal CDR settings.
Table 17: SATA Group Parameters for Receiver Procedures at a Specific Data Rate (1.5 Gb/s, 3.0 Gb/s, 6.0 Gb/s)
Table
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4.6.4 Rx Jitter Tolerance Test (RSG-01 Gen1, RSG-02 Gen2, and RSG-03 Gen3)
The Rx Jitter Tolerance test is available for all data rates.
Figure 4-25: Rx Jitter Tolerance Test
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4.6.4.1
Purpose
This test verifies that the receiver is able to recover data in presence of
jitter. It is an official receiver compliance test that has to be passed in order
to obtain SATA certification. Separate versions of this test are available for
all data rates:
 RSG-01 Gen1 Rx Jitter Tolerance Test runs at 1.5 Gbit/s
 RSG-02 Gen2 Rx Jitter Tolerance Test runs at 3.0 Gbit/s
 RSG-03 Gen3 Rx Jitter Tolerance Test runs at 6.0 Gbit/s
A compliant DUT must pass all the tests up to and including the one for the
highest supported data rate. Refer to the beginning of the Receiver Test
Procedures (page 87) for a description of the general operating principle of
all SATA receiver tests.
4.6.4.2
Procedure
The stress applied to the data signal is RJ and SJ. There is a set of
compliance frequencies for the SJ. For each frequency the DUT has to loop
back the pattern for the complete test duration without error. The test
duration for a single frequency at different data rates is given as:
 10 minutes for RSG-01 Gen1 (1.5 Gbit/s)
 5 minutes for RSG-02 Gen2 (3.0 Gbit/s)
 2.5 minutes for RSG -03 Gen3 (6.0 Gbit/s)
The compliance jitter frequencies for UTD 1.2 are 5 MHz, 33 MHz, and 62
MHz. The compliance jitter frequencies for UTD 1.3 and higher versions are
5 MHz, 10 MHz, 33 MHz, and 62 MHz.
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4.6.4.3
Connection Diagram
Figure 4-26: Rx Jitter Tolerance Test
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4.6.4.4
Parameters
Parameter Name
Parameter Description
Number of
Allowed Frame
Errors
Test Duration
This is the number of frame errors that are allowed. The
default value is '0'.
The duration of the frame error measurement at each SJ
frequency.
Data Generator
Differential
Voltage
Random Jitter
(RJ)
Total Jitter (TJ)
Sinusoidal Jitter
(SJ)
Data Rate
Deviation
SSC Deviation
SSC Frequency
The calibrated inner eye height at TP2.
The amount of calibrated RJ added to the signal.
The amount of calibrated TJ added to the signal. This is only
available for UTD versions < 1.4.
The amount of calibrated SJ added to the signal. This is only
available for UTD versions ≥ 1.4.
A fixed deviation from the nominal data rate.
Maximum amount of deviation from the nominal data rate due
to down-spread SSC modulation.
The frequency of the SSC modulation.
Error Detector
Show Additional
Counters
Additional counters, such as the frame counter, are shown in
the result table.
Table 18: SATA Procedure Parameters for Rx Jitter Tolerance (RSG-01, RSG-02, RSG-03) Table
4.6.4.5
Dependencies
Refer to Dependencies for All Receiver Tests for details.
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4.6.4.6
Results
An example MS-Excel worksheet for the Rx Jitter Tolerance Test procedure
is shown in Figure 4-27. The result sheet contains the following data:
 A parameter list
A data table with the tested SJ frequencies and measured frame errors
(refer to Table 19)
Figure 4-27: Example MS-Excel Worksheet for Rx Jitter Tolerance Test
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Parameter Name
Parameter Description
Result
“Pass”/“Fail”, if the FER test at a specific frequency
is passed, the value is “Pass” otherwise “Fail”.
This is the frequency value of the SJ that is applied to
the test signal.
The number of frame errors that occurred during the
observation time.
SJ Frequency
Frame Errors
Table 19: Rx Jitter Tolerance Test Data Table
4.6.5 RSG-05 Receiver Stress Test at +350 ppm (for 1.5 Gbit/s)
It is available for only 1.5 Gbit/s data rate.
Figure 4-28: RSG-05 Receiver Stress Test at +350 ppm
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4.6.5.1
Purpose
This is the official receiver data rate deviation tolerance test that has to be
passed in order to obtain SATA certification. It was introduced in UTD
version 1.4 and so is not available for earlier versions. This test is always
performed at the data rate 1.5 Gbit/s even if the DUT supports higher data
rates.
4.6.5.2
Procedure
A data rate deviation of +350 ppm is applied to the data signal. The UTD
specifies that this test must run for at least 18 successive iterations of the
Framed COMP pattern, which is a bit more than 1 ms. The test runs for a
whole second.
4.6.5.3
Connection Diagram
The connection diagram is as shown in Figure 4-26.
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4.6.5.4
Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Test Duration
This is the number of frame errors that are allowed.
The default value is '0'.
The duration of the frame error measurement.
Data Generator
Differential Voltage
The calibrated inner eye height at TP2.
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
Total Jitter (TJ)
The amount of calibrated TJ added to the signal. This
is only available for UTD versions < 1.4.
The frequency of the calibrated SJ added to the signal.
SJ Frequency
Sinusoidal Jitter (SJ)
Data Rate Deviation
SSC Deviation
The amount of calibrated SJ added to the signal. This
is only available for UTD versions ≥ 1.4.
A fixed deviation from the nominal data rate.
Maximum amount of deviation from the nominal data
rate due to down-spread SSC modulation.
The frequency of the SSC modulation.
SSC Frequency
Error Detector
Show Additional Counters
Additional counters, such as the frame counter, are
shown in the result table.
Table 20: SATA Procedure Parameters for RSG-05 Receiver Stress Test at +350 ppm
(for 1.5 Gbit/s) Table
4.6.5.5
Dependencies
Refer to Dependencies for All Receiver Tests for details.
4.6.5.6
Results
An example MS-Excel worksheet for the RSG-05 Receiver Stress Test at
+350 ppm procedure is shown in Figure 4-29. The result sheet contains the
following data:
 A parameter list
A data table for the measured frame errors (refer to Table 21)
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Figure 4-29: Example MS-Excel Worksheet for RSG-05 Receiver Stress Test at +350ppm
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Parameter Name
Parameter Description
Result
“Pass”/“Fail”, if the FER (Frame Error Rate) test at a
specific frequency is passed, the value is “Pass”
otherwise “Fail”.
The number of frame errors that occurred during the
observation time.
Frame Errors
Table 21: RSG-05 Receiver Stress Test at +350 ppm Data Table
4.6.6 RSG-06 Receiver Stress Test with SSC (for 1.5 Gbit/s)
It is available for only 1.5 Gbit/s data rate.
Figure 4-30: RSG-06 Receiver Stress Test with SSC
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4.6.6.1
Purpose
This is the official receiver SSC tolerance test defined in the UTD. It is
defined as an informative test, so passing it is not required to obtain SATA
certification. It was introduced in UTD version 1.4 and so is not available for
earlier versions. This test is always performed at the data rate 1.5 Gbit/s,
even if the DUT supports higher data rates.
4.6.6.2
Procedure
The stress that is applied to the data signal for this test is 5000 ppm downspread SSC at 33 kHz and a Data Rate Deviation of –350 ppm. The UTD
specifies that this test must run for at least 18 successive iterations of the
Framed COMP pattern, which is a bit more than 1 ms. The test runs for a
whole second.
4.6.6.3
Connection Diagram
The connection diagram is as shown in Figure 4-26.
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4.6.6.4
Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Test Duration
This is the number of frame errors that are allowed.
The default value is '0'.
The duration of the frame error measurement.
Data Generator
Differential Voltage
The calibrated inner eye height at TP2.
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
Total Jitter (TJ)
The amount of calibrated TJ added to the signal. This
is only available for UTD versions < 1.4.
The frequency of the calibrated SJ added to the signal.
SJ Frequency
Sinusoidal Jitter (SJ)
Data Rate Deviation
SSC Deviation
The amount of calibrated SJ added to the signal. This
is only available for UTD versions ≥ 1.4.
A fixed deviation from the nominal data rate.
Maximum amount of deviation from the nominal data
rate due to down-spread SSC modulation.
The frequency of the SSC modulation.
SSC Frequency
Error Detector
Show Additional Counters
Additional counters, such as the frame counter, are
shown in the result table.
Table 22: SATA Procedure Parameters for RSG-06 Receiver Stress Test with SSC (for 1.5 Gbit/s) Table
4.6.6.5
Dependencies
Refer to Dependencies for All Receiver Tests for details.
4.6.6.6
Results
An example MS-Excel worksheet for the RSG-06 Receiver Stress Test with
SSC procedure is shown in Figure 4-31. The result sheet contains the
following data:
 A parameter list
 A data table for the measured frame errors (refer to Table 23)
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Figure 4-31: Example MS-Excel Worksheet for RSG-06 Receiver Stress Test with SSC
Parameter Name
Parameter Description
Result
“Pass”/“Fail”, if the FER test at a specific frequency is
passed, the value is “Pass” otherwise “Fail”.
The number of frame errors that occurred during the
observation time.
Frame Errors
Table 23: RSG-06 Receiver Stress Test with SSC Data Table
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4.6.7 Rcvr Constant Parameter Stress Test
It is available foe all data rates.
Figure 4-32: Rcvr Constant Parameter Stress Test
4.6.7.1
Purpose
The Rcvr Constant Parameter Stress Test examines the DUT with a
combination of jitter parameters where the Rcvr Jitter Tolerance Test or one
of the compliance tests raises a problem with the specific combination.
When the problem is already reduced to a single point, it avoids testing for a
range of frequencies.
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4.6.7.2
Procedure
This is a debugging test and very similar to the RSG-01/RSG-02/RSG-03 Rx
Jitter Tolerance Tests. The only difference is that only one FER
measurement is performed. The frequency of the SJ component can be
selected.
4.6.7.3
Connection Diagram
The connection diagram is as shown in Figure 4-26.
4.6.7.4
Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Test Duration
This is the number of frame errors that are allowed.
The default value is '1'.
The duration of the frame error measurement.
Data Generator
Differential Voltage
The calibrated inner eye height at TP2.
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
Total Jitter (TJ)
The amount of calibrated TJ added to the signal. This
is only available for UTD versions < 1.4.
The frequency of the calibrated SJ added to the signal.
SJ Frequency
Sinusoidal Jitter (SJ)
Data Rate Deviation
SSC Deviation
SSC Frequency
The amount of calibrated SJ added to the signal. This
is only available for UTD versions ≥ 1.4.
A fixed deviation from the nominal data rate.
Maximum amount of deviation from the nominal data
rate due to down-spread SSC modulation.
The frequency of the SSC modulation.
Error Detector
Show Additional Counters
Additional counters, such as the frame counter, are
shown in the result table.
Table 24: SATA Procedure Parameters for Rcvr Constant Parameter Stress Test Table
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4.6.7.5
Dependencies
Refer to Dependencies for All Receiver Tests for details.
4.6.7.6
Results
An example MS-Excel worksheet for the Rcvr Constant Parameter Stress
Test procedure is shown in Figure 4-33. The result sheet contains the
following data:
 A parameter list
 A data table for the measured Frame Errors
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Figure 4-33: Example MS-Excel Worksheet for Rcvr Constant Parameter Stress Test
Refer to Table 25 for parameter description.
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Parameter Name
Parameter Description
Result
“Pass” or ”Fail”.
Frame Errors
This is the number of frame errors occurred during the
observation time.
Table 25: Rcvr Constant Parameter Stress Test Data Table
4.6.8 Rcvr Jitter Tolerance Test
This test is available for all data rates.
Figure 4-34: Rcvr Jitter Tolerance Test
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4.6.8.1
Purpose
The Rcvr Jitter Tolerance Test determines how much jitter a DUT can
tolerate at different SJ frequencies.
4.6.8.2
Procedure
The test procedure depends on the selected value of the Search Algorithm
property. The different types of Search Algorithms are explained below. The
selected algorithm is sequentially used over a range of jitter frequencies
defined with the Min Jitter Frequency, Max Jitter Frequency, Number of
Frequency steps and Include Compliance Frequencies properties. At each
jitter frequency value the maximum jitter amplitude where the DUT produced
no more frame errors than the Number of Allowed Frame Errors is stored as
the max passed jitter value.
The result is a curve that shows the maximum jitter that the DUT can
tolerate over the SJ frequency. It reflects the Rx clock data recovery (CDR)
characteristics of the DUT. Typically the CDR can follow low frequency jitter
(f < Rx phase-locked loop (PLL) bandwidth) better than high frequency jitter
(f > Rx PLL bandwidth).
All search algorithms start with a jitter amplitude value defined by the “Start
Sinusoidal Jitter” property value.
Search Algorithms:


LinearUp
This algorithm increases the applied jitter amplitude linearly with
the value of “Jitter Step Size” until a test point is failed.
LinearUp2Layer
This algorithm first increases the applied jitter amplitude linearly
using large steps. When an error is found, it jumps back to the
previous test point (which passed the test) and starts increasing
linearly again with small steps of “Jitter Step Size” value. The size
of the larger steps depends on the relation between Jitter Step Size
and difference between the maximum jitter possible with the setup
and the “Start Sinusoidal Jitter” property value. It is calculated as:
√
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
LinearUpHysteresis
This algorithm first increases the applied jitter amplitude linearly
using large steps. When an error is found it goes back to the
previous test point (which passed the test) and tests that one again.
If it fails with the applied jitter amplitude is decreased using midsized steps until a test point succeeds. From there the applied jitter
amplitude is increased again using small steps (the selected “Jitter
Step Size” value) until an error is found again. The value of the large
step size is calculated the same way as for LinearUp2Layer. The size
of the medium steps is calculated as:
√
⁄
The stepping down with the mid-sized steps is conducted to ensure that
DUTs with hysteresis are not stuck in their failed-state when the final part of
the search algorithm starts. For DUTs that do not have any hysteresis the
search is performed almost exactly like LinearUp2Layer. There is only one
test point more.
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4.6.8.3
Connection Diagram
The connection diagram is as shown in Figure 4-26.
4.6.8.4
Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Number of Frames
This is the number of frame errors that are allowed. The default
value is '1'.
The number of frames used for frame error measurement.
Frequency Mode
Frequency Scale
It can be selected as:
 Compliance Frequencies
 Equally Spaced Frequencies
 User Defined Frequencies
 Single Frequency
It is chosen as Linear or Logarithmic scale.
Min Jitter Frequency
The first jitter frequency used for the test.
Max Jitter Frequency
The last jitter frequency used for the test.
Number of Frequency
Steps
The number of different jitter frequencies that are tested. The
distribution of frequencies between minimum and maximum is
equidistant on a either a logarithmic or a linear scale, depending
on the “Frequency Scale” value.
If this value is set to true the test uses the compliance jitter
frequencies in addition to the frequencies defined by the other
parameters.
It is the initial value of the SJ for the procedure.
Include Compliance
Frequencies
Start Sinusoidal Jitter
Jitter Step Size
Search Algorithm
It is the jitter value to be increased/decreased at each step of the
procedure.
Select how the test searches for the fail point for each frequency.
Data Generator
Differential Voltage
The calibrated inner eye height at TP2.
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
Data Rate Deviation
A fixed deviation from the nominal data rate.
SSC Deviation
Maximum amount of deviation from the nominal data rate due to
down-spread SSC modulation.
The frequency of the SSC modulation.
SSC Frequency
Table 26: SATA Procedure Parameters for Rcvr Jitter Tolerance Test Table
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4.6.8.5
Dependencies
Refer to Dependencies for All Receiver Tests for details.
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4.6.8.6
Results
An example MS-Excel worksheet for the Rcvr Jitter Tolerance Test
procedure is shown in Figure 4-36. The result sheet contains the following
data:
 A test data graph
 A parameter list
 A data table for the measurement results (refer to Table 27)
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Figure 4-35: Example MS-Excel Worksheet for Rcvr Jitter Tolerance Test
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Parameter Name
Parameter Description
Result
“Pass” or ”Fail”.
Sinusoidal Jitter
Frequency
Max Passed Jitter
This is the value of SJ frequency applied to the test signal.
This is the maximum value of SJ that the DUT can tolerate at a
specific SJ frequency.
This is the maximum value of jitter that the test setup can
generate at a specific SJ frequency.
This is the smallest value of jitter that the DUT must tolerate in
order to pass the test.
This is the margin between the max passed jitter and min spec.
Jitter Capability Test
Setup
Min Spec
Margin
Table 27: Rcvr Jitter Tolerance Test Data Table
4.6.9 Rcvr Sensitivity Test
This test is available for all data rates.
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Figure 4-36: Rcvr Sensitivity Test
4.6.9.1
Purpose
The Rcvr Sensitivity Test determines the minimum eye opening (differential
voltage) the DUT can tolerate.
4.6.9.2
Procedure
This test starts with the differential voltage set to the “Start Voltage” value.
It is decreased linearly by the “Voltage Step Size” value each step until
either an error is found or the “Stop Voltage” value is reached without an
error. The minimum passed value is the last test point that did not return an
error.
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4.6.9.3
Connection Diagram
The connection diagram is as shown in Figure 4-26.
4.6.9.4
Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Number of Frames
This is the number of frame errors that are allowed. The default
value is '1'.
The number of frames used for frame error measurement.
Start Voltage
The value at which the test starts with initial calibrated eye
opening at TP2.
The last calibrated eye opening at TP2.
Stop Voltage
Voltage Step Size
The amount the calibrated eye opening at TP2 is changed from
step to step.
Data Generator
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
SJ Frequency
The frequency of the calibrated SJ added to the signal.
Sinusoidal Jitter (SJ)
The amount of calibrated SJ added to the signal.
Data Rate Deviation
A fixed deviation from the nominal data rate.
SSC Deviation
Maximum amount of deviation from the nominal data rate due to
down-spread SSC modulation.
The frequency of the SSC modulation.
SSC Frequency
Table 28: SATA Procedure Parameters for Rcvr Sensitivity Test Table
4.6.9.5
Results
An example MS-Excel worksheet for the Rcvr Sensitivity Test procedure is
shown in Figure 4-37. The result sheet contains the following data:
 A parameter list
 A data table for the min passed differential voltage, min spec, and
margin (refer to Table 29)
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Figure 4-37: Example MS-Excel Worksheet for Rcvr Sensitivity Test
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Parameter Name
Parameter Description
Result
“Pass” or ”Fail”.
Min Passed Differential
Voltage
Min Spec
This is the minimum differential eye opening that the DUT can
tolerate.
This is the minimum differential eye opening for which the DUT
must pass the test.
This is the margin between min passed differential voltage and
min spec.
Margin
Table 29: Rcvr Sensitivity Test Data Table
4.6.10 Rcvr Data Rate Deviation Tolerance
This test is available for all data rates.
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Figure 4-38: Rcvr Data Rate Deviation Tolerance
4.6.10.1 Purpose
This test determines the maximum data rate deviation (positive and
negative) the DUT can tolerate.
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4.6.10.2 Procedure
The test starts with a data rate deviation value of '0' ppm. The data rate
deviation is decreased linearly with large steps until either the value of “Min
Deviation” is reached or an error is found. When an error is found, the data
rate deviation is set back to the last passed test point. From there it is
decreased linearly again with smaller steps (“Deviation Step Size” value)
until an error is found. The minimum passed value is the final test point that
returns no error. The larger step size value used for this test depends on the
relation between “Deviation Step Size” and “Min Deviation”. It is calculated
as:
D v
on
z
√ ∣
nD v
on ∣⁄D v
on
z
For the default values of Deviation Step Size = 10 ppm and Min Deviation =
–1000 ppm, the value of an initial step size is 100 ppm.
Once the minimum passed value has been found, the test performs the
same method for the upper limit with “Max Deviation” and positive steps
instead of “Min Deviation” and negative steps.
This algorithm avoids initializing a DUT repeatedly, which makes the DUT
come out of loopback mode. If an error occurs, it requires fewer test points
than a simple linear search.
4.6.10.3 Connection Diagram
The connection diagram is as shown in Figure 4-26.
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4.6.10.4 Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Number of Frames
This is the number of frame errors that are allowed. The default
value is '1'.
The number of frames used for frame error measurement.
Deviation Step Size
The minimum distance between two tested data rate deviations.
Min Deviation
If no error occurs, this is the lowest data rate deviation that is
tested.
If no error occurs, this is the highest data rate deviation that is
tested.
Max Deviation
Data Generator
Differential Voltage
The calibrated inner eye height at TP2.
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
SJ Frequency
The frequency of the calibrated SJ added to the signal.
Sinusoidal Jitter (SJ)
The amount of calibrated SJ added to the signal.
SSC Deviation
Maximum amount of deviation from the nominal data rate due to
down-spread SSC modulation.
The frequency of the SSC modulation.
SSC Frequency
Table 30: SATA Procedure Parameters for Rcvr Data Rate Deviation Tolerance Table
4.6.10.5 Dependencies
Refer to Dependencies for All Receiver Tests for details.
4.6.10.6 Results
An example MS-Excel worksheet for the Rcvr Data Rate Deviation Tolerance
Test procedure is shown in Figure 4-39. The result sheet contains the
following data:
 A parameter list
 A data table for the min passed data rate deviation and max passed
data rate deviation (refer to Table 31)
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Figure 4-39: Example MS-Excel Worksheet for Rcvr Data Rate Deviation Tolerance Test
Parameter Name
Parameter Description
Result
“Pass”or ”Fail”.
Min Passed Data Rate
Deviation
Max Passed Data Rate
Deviation
This is the minimum data rate deviation that the DUT can tolerate.
This is the maximum data rate deviation that the DUT can
tolerate.
Table 31: Rcvr Data Rate Deviation Tolerance Test Data Table
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4.6.11 Rcvr SSC Tolerance Test
This test is available for all data rates.
Figure 4-40: Rcvr SSC Tolerance Test
4.6.11.1 Purpose
This test determines the maximum down spread SSC the DUT can tolerante.
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4.6.11.2 Procedure
The test sequentially steps through a range of SSC frequencies defined with
the “Min SSC Frequency”, “Max SSC Frequency” and “Number of SSC
Frequency Steps” properties. At each SSC frequency value the maximum
SSC amplitude where the DUT produced no more frame errors than the
“Number of Allowed Frame Errors”value is stored as the max passed SSC
value. The next paragraph describes how that value is determined for a
given SSC frequency value.
The test starts with an SSC deviation value of '0' ppm. The deviation value is
increased using large steps until either the value of “Max SSC Deviation” is
reached or an error is found. When an error is found, it goes back to the
previous passed test point. Then the deviation value is increased again, this
time with smaller steps (the selected “SSC Step Size” value) until an error
occurs again. The maximum passed value is the last test point that did not
return an error. The step size value for the larger steps at the beginning
depends on the relation between the “SSC Step Size” and “Max Deviation”.
It is calculated as:
z
√ ∣
D v
on ∣⁄
z
For the default values of SSC Step Size = 50 ppm and Max Deviation = 5000
ppm, the initial step size is 500 ppm.
This algorithm avoids initializing a DUT repeatedly, which makes the DUT
come out of the loopback mode. If an error is encountered, it requires fewer
test points than a simple linear search.
4.6.11.3 Connection Diagram
The connection diagram is as shown in Figure 4-26.
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4.6.11.4 Parameters
Parameter Name
Parameter Description
Number of Allowed Frame
Errors
Number of Frames
This is the number of frame errors that are allowed. The default
value is '1'.
The number of frames used for frame error measurement.
SSC Step Size
The minimum distance between two tested SSC values.
Max SSC Deviation
If no error occurs, this is the maximum SSC value to be tested.
Min SSC Frequency
This is the minimum value of the SSC frequency to be used for the
procedure.
This is the highest SSC frequency value to be tested.
Max SSC Frequency
Number of SSC Frequency
Steps
It is the number of different SSC frequencies to be tested. The
distribution of frequencies between minimum and maximum is
equidistant.
Data Generator
Differential Voltage
The calibrated inner eye height at TP2.
Random Jitter (RJ)
The amount of calibrated RJ added to the signal.
SJ Frequency
The frequency of the calibrated SJ added to the signal.
Sinusoidal Jitter (SJ)
The amount of calibrated SJ added to the signal.
Data Rate Deviation
A fixed deviation from the nominal data rate.
Table 32: SATA Procedure Parameters for Rcvr SSC Tolerance Test Table
4.6.11.5 Dependencies
Refer to Dependencies for All Receiver Tests for details.
4.6.11.6 Results
An example MS-Excel worksheet for the Rcvr SSC Tolerance Test procedure
is shown in Figure 4-41. The result sheet contains the following data:
 A test data graph
 A parameter list
 A data table for the SSC frequency and max passed deviation (refer
to Table 33)
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Figure 4-41: Example MS-Excel Worksheet for Rcvr SSC Tolerance Test
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Parameter Name
Parameter Description
Result
“Pass”or ”Fail”.
SSC Frequency
This is the value of the SSC frequency applied to the test signal.
Max Passed Deviation
This is the highest SSC value that the DUT can tolerate.
Table 33: Rcvr SSC Tolerance Test Data Table
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Troubleshooting and Support
5 Troubleshooting and Support
5.1 Log List and File
In the case of problems the Log List can often help identifying the root cause. To
activate the Log List, click on the Log List button. The log file can be accessed by
right-clicking within the Log List section as
shown in Figure 5-1. Note that all log information will be lost when the N5990A
application is terminated unless the log file is saved manually.
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Troubleshooting and Support
Figure 5-1: ValiFrame N5990A Log List and File
In case of persisting problems with an application, send the Log File with a problem
description to: [email protected]
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6 Appendix
6.1 Data Structure and Backup
6.1.1 ValiFrame Data Straucture
All ValiFrame internal data is saved in the application data folder:
"Documents and Settings\All Users\Application Data\BitifEye \ValiFrame" for
Windows XP or "ProgramData\BitifEye\ValiFrame" for Windows 7.
Windows hides the system folders by default. To make the application data folder
visible, the "Hidden Files and Folders" setting needs to be set to "Show hidden files
and folders" in the Windows file explorer > View settings.
The ValiFrame application data folder contains the following folders:





6.1.1.1
Images
Settings
Pattern
Calibrations
Tmp
Images
The "Images" folder contains the connection diagram images.
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6.1.1.2
Settings
The “Settings” folder contains the default setting file for the instrument and .vset files
which contains the changes to the default registry entries. For each application, a
sub folder is created and a ValiFrame.vset file is created in this sub folder as soon as
any ValiFrame setting is changed from its default. The settings files contain for
example the instrument connection setup.
6.1.1.3
Pattern
The Pattern folder contains the test pattern files. These are text files which contain
the pattern in hexadecimal format.
6.1.1.4
Calibrations
The calibration data is stored in the “Calibrations” folder. For each calibration
procedure at least one calibration file is stored. These files are text files and can be
imported into MS Excel.
6.1.1.5
Tmp
All temporary files are created in the Tmp folder. The sub folder "Results" contains
the Excel file of the final result of each calibration and test procedure. This is a safety
feature and these files are used for recovery in case the user forgot to save them.
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6.1.2 ValiFrame Backup
Use the ValiFrame application data folder to save calibration data, modified test
pattern or settings for backup or transfer to another PC.
The files in the folders, “Images” and “Pattern” will be generated or if they already
exist, be overwritten during a ValiFrame installation. In the “Settings” folder, all
instrument settings are overwritten by the installation except the .vset files. In the
“Calibration” folder, all files are generated by the calibration procedures and will not
be overwritten by the installation. To compare or archive the calibration data, backup
the “Calibration” folder.
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6.2 Remote Interface
6.2.1 Introduction
The N5990A ValiFrame remote interface allows ValiFrame functionality (such as test
setup information, calibration and test procedures, and results) to be accessed from
external programming environments, for example MS.NET/C#, VEE, LabView,
TestExec SL, or TestStand. The remote interface can thus be used to control N5990A
by external software. In typical use, a top-level external test sequencer takes
advantage of ValiFrame functionality.
If ValiFrame is to be used as a top-level test sequencer, the control of external
software is achieved with N5990A opt. 500, User Programming. Refer to the User
Programming Manual for details.
6.2.2 Interface Description
The ValiFrame functionality is accessible via ValiFrameRemote.dll. It contains a class
ValiFrameRemote in the BitifEye.ValiFrame.ValiFrameRemote namespace (see
Figure 6-1). Its use is illustrated by the ValiFrameRemoteTester application. The
source code and the Visual Studio solution of this example are available on the
BitifEye support webpage. Using this interface requires that the ValiFrame dlls are
either in the same folder or the Windows Path variable contains the folder in which
these dlls are located.
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Figure 6-1: Members of the ValiFrameRemote Class
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6.2.3 Using the Remote Interface
1.
2.
3.
4.
Add the ValiFrameRemote.dll as a reference to the project.
Create an instance of the ValiFrameRemote class.
Call SetConfigurationFile(string filename), if it is needed. It is required only
when the station configuration file generated by the station configurator is
not to be used. This file format is same as the files generated by the station
configurator, which can be found in the Valiframe Application data folder
(Windows XP: C:\documents and settings\all users\application
data\bitifeye\valiframe\settings\<application name>\ValiFrame.vset, or
Windows 7: c:\programdata\bitifeye\valiframe\settings\<application
name>\ValiFrame.vset). The station configuration files contain just the
differences to the registry. Refer to Figure 6-2 for more details.
By calling InitApplication(string applicationName), the instruments of the
selected Test Station (see section
applicationName is SATA.
3.1) are connected and initialized. The
5. Call either ConfigureApplication() or LoadProject(string filename)
to initialize the DUT properties and test procedures. The project file
can be generated with the ValiFrame User Interface and it contains
the DUT properties, the selected test procedures and the properties
of each test procedure.
6. Calling Configure Application() prompts a dialog for setting the DUT
properties.
The number and type of available test procedures can depend on the DUT properties!
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7.
Get the list of available procedures with GetProcedures(out int[]
procedureIds, out string[] procedureNames[]).
8. Select procedures individually with SelectProcedures(int[] procedureIds) or
combined with Run(int[] procedureIds, out stringxmlResult).
9. Execute selected procedures by calling any of the Run functions given
below:
10. The Run(out string[]xmlResults) executes all selected procedures. The
results of all procedures executed are returned at the end of the execution
of all selected procedures.
The RunProcedure(int id, out string xmlResult) executes a single procedure
and returns the result in an xml formatted string.
The RunProcedures(int[] procedureIds, out string[] xmlResults) executes
the list of procedures given in the procedureIds array.
The StartRun() function returns immediately. It is mainly used for
event-driven programming. In this case the events StatusChanged()
and ProcedureCompleted() can be used to determine the actual status of
the ValiFrame sequencer and read the results. The
ProcedureCompleted() event
provides the ID and the xmlResult of the procedure completed. After the run the
xmlResults are also
available via the Result property.
<?xml version="1.0" encoding="utf-8" standalone="yes"?>
<Folder name="ValiFrame">
<Folder name="Stations">
<Folder name="SATA Station">
<Folder name="Instruments">
<Folder name="Instrument8">
<Property name="Address">TCPIP0::192.168.0.112::inst0::INSTR</Property>
<Property name="Offline">False</Property>
</Folder>
<Folder name="Instrument9">
<Property name="Address">192.168.0.112</Property>
<Property name="Offline">False</Property>
</Folder>
<Folder name="Instrument12">
<Property name="Offline">False</Property>
<Property name="Address">TCPIP0::192.168.0.111::inst0::INSTR</Property>
<Property name="Timeout">00:00:30</Property>
<Property name="Description">M8020A J-BERT with integrated jitter
sources for FER tests</Property>
<Property name="Dll">VFAgM8000.dll</Property>
</Folder>
<Folder name="Instrument13">
<Property name="Offline">True</Property>
<Property name="Address">TCPIP0::192.168.0.120::inst0::INSTR</Property>
<Property name="Timeout">00:01:00</Property>
<Property name="Description">DCA-J with differential TDR module, needed
for Tx/Rx tests</Property>
<Property name="Dll">VFAgDca.dll</Property>
</Folder>
<Folder name="Instrument14">
<Property name="Offline">True</Property>
<Property name="Address">TCPIP0::192.168.0.102::inst0::INSTR</Property>
<Property name="Timeout">00:01:00</Property>
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<Property name="Description">Signal generator used to generate
SSC</Property>
<Property name="Dll">VFAgE4438C.dll</Property>
</Folder>
<Folder name="Instrument15">
<Property name="Offline">True</Property>
<Property name="Address">GPIB0::12::INSTR</Property>
<Property name="Timeout">00:01:00</Property>
<Property name="Description">Triangle source used to generate
SSC</Property>
<Property name="Dll">VFAg33250A.dll</Property>
</Folder>
<Folder name="Instrument16">
<Property name="Offline">True</Property>
<Property name="Address">4000</Property>
<Property name="Timeout">00:01:00</Property>
<Property name="Description">SerialTek BusXpert protocol
analyzer</Property>
<Property name="Dll">BusXpert.dll</Property>
</Folder>
<Folder name="Instrument17">
<Property name="Offline">False</Property>
<Property name="Address">192.168.0.113;username;password</Property>
<Property name="Timeout">00:01:00</Property>
<Property name="Description">Main power switch</Property>
<Property name="Dll">VFNetIo230B.dll</Property>
</Folder>
</Folder>
<Folder name="Properties">
<Property name="Station Name">Unknown</Property>
<Property name="Show All Instruments">False</Property>
<Property name="System Configuration">Unknown</Property>
<Property name="Data Generator Type">JBERT M8020A</Property>
<Property name="Error Detector Type">JBERT M8020A</Property>
<Property name="BIST-L Activation Type">Automated</Property>
<Property name="BIST-T Activation Type">Automated</Property>
<Property name="Power Switch Type">NetIo230B</Property>
</Folder>
</Folder>
</Folder>
</Folder>
Figure 6-2: Example of a Station Configuration File
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If the ValiFrame sequencer is called via a .NET GUI
(System.Windows.Forms.Form), the current status, the available procedures,
and the procedure selection can be shown and modified by passing a
TreeView control via the ProductPreTreeView property to the ValiFrame
sequencer prior to the InitApplication() call. In this case, the TreeView
control directly shows which procedures were selected as well as the
procedure currently being processed during the run. At the end of each run,
the pass/fail result is given. Refer to the ValiFrameRemoteTester source
code for more details.
The log entries generated by the ValiFrame sequencer can be accessed via
the LogChanged() event. Each time the sequencer generates a log entry this
event will be broadcast. It is recommended that the user monitors this event
and tracks the log changes to identify problems during execution.
The procedures requiring interaction with the user will pop up dialog panels.
For example, each time a new connection between an instrument and the
DUT is necessary, the procedure will start to display pop-up windows with
the required connections. The dialog can be suppressed by attaching to the
ConnectionChangeRequired() event. In some cases, internal dialogs or
message boxes are also shown. For full automation without any user
interaction, events must be defined and implemented such that the
controlling environment can react to all dialog and message boxes without
user input. Currently, how to handle these dialogs has to be decided case by
case.
6.2.4 Results Format
Each Procedure Run will produce an xml-formatted result string, which can
be accessed via the out parameters of the Run() functions or the Results
property of the ValiFrameRemote class. The result string starts with a
summary, which contains the procedure name, ID, result, and the time
stamp of the procedure run (Figure 6-3):
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<?xml version="1.0" encoding="utf-16"?>
<Test Results>
<Summary>
<ProcedureName>Jitter Tolerance Test 2 MHz SJ RBR Lane 0</ProcedureName>
<ProcedureID>400008</ProcedureID>
<Result>Passed</Result>
<DateTime>4/30/2009 11:29:14 AM</DateTime>
</Summary>
<DocumentElement>
<Parameters>
<Name>Number of Lanes</Name>
<Value>1</Value>
</Parameters>
<Parameters>
<Name>Spec. Version</Name>
<Value>1.1</Value>
</Parameters>
<Parameters>
<Name>ISI Amplitude</Name>
<Value>570 mUI</Value>
</Parameters>
<Parameters>
<Name>Step Mode</Name>
<Value>False</Value>
</Parameters>
<Parameters>
<Name>Parade DP621 Device</Name>
<Value>False</Value>
</Parameters>
</DocumentElement>
<Data>
<ColumnHeader>|Result|Jitter Freq.|Sin.-Jitter Amp.|Number of Errors|Min
Spec|Max Spec|Details|</ColumnHeader>
<Values>|pass|2000000|0.981|2|0|1000||</Values>
</Data>
</Test Results>
Figure 6-3: Result String Format
The following part contains the list of parameters. These parameters may be
changed via the project file or the remote interface. The last part contains
the test data. It starts with the column header, followed by one or more data
rows. The format is similar to what is obtained in the Excel output if the
same procedure is run via the ValiFrame user interface. Each column
name/value is separated by the pipe symbol '|'.
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6.3 Controlling Loop Parameters and Looping Over Selected Tests
Often parameters such as temperatures or supply voltages need to be varied
systematically. A simple example would be repeating tests over a
temperature range from –10 to 30 °C to verify an operating temperature
range. In this case, after the tests have been run at –10 °C, the temperature
of the climate chamber is increased by the selected temperature step width,
for example, 1°C. The tests are then repeated at –9 °C. After the test
execution, the temperature is incremented again and the tests are rerun
repeatedly until they are finally run at 30 °C. This repetitive process is called
looping. In this example, the temperature within a climate chamber is the
loop parameter. While the loop is executed, the test results have to be
documented for each loop parameter value. In practice, multiple loop levels
might be required, as shown in Figure 6-4.
Figure 6-4: Temperature and Voltage Sweeps using N5990A Sequencer
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As the loop parameters are typically customer-specific, N5990A permits a
list of loop parameters to be specified. N5990A supports:
1. Looping over user-specified parameters or run tests with a single
parameter value.
2. Defining a set of loop parameters and for each parameter a range of
test points.
3. Using custom drivers to control instruments that are not part of the
ValiFrame Test Station (see Chapter 4, Test Station Selection and
Configuration), e.g. climate chambers, ovens, and power supplies.
4. Saving the results of each test together with the actual loop
parameter value independently of the results from the other runs.
5. An overview of each run after the end of the test execution.
These features are provided by an interface called IVFEnvironmentalControl.
The definition of this interface is:
namespace BitifEye.ValiFrame.Instruments
{
public interface IVFEnvironmentalControl
{
string UserLabel { get; }
void Connect();
void Disconnect();
string[] GetParameterList();
string[] GetParameterValues();
void Init();
bool SetNextValue();
void SetToDefault();
}
}
The interface has to be implemented by a class EnvironmentalControl in
a .NET dll named EnvironmentalControl.dll, which then needs to be copied
into the ValiFrame Program Files Folder. ValiFrame will load this dll and call
the function of the Interface in the following order:
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6.3.1 Connect()
At startup of ValiFrame allows the implementation to load the instrument
drivers and connect to them.
6.3.2 SetToDefault()
After the Connect() call, the implementation should set all instruments with
initial values to set default values. It is recommended that the sequence is
stated with nominal values to ensure that the test setup is done properly.
With this setting, the first run will be done and the Init() call will not
overwrite the values.
6.3.3 Init()
The function is used to initialize the instruments with start values at the
beginning of test sequence.
6.3.4 GetParameterList() and GetParameterValues()
These functions are used to get the parameter names and values lists and
put them into the result output of each test procedure.
6.3.5 SetNextValue()
If this function returns true at the end of each run over the selected test
procedures, ValiFrame will run the selected tests again. This function should
get the next parameter set, set the controlling instruments, and return true if
a new set of parameters is available.
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6.3.5.1
Example
For a sweep over temperature starts at 20 °C, increasing the temperature by
2 °C at each run, and ending at 40 °C, the function should increase the
temperature of the chamber and return true if 40 °C is not reached. If the
next step is greater than 40 °C, this function should return false. ValiFrame
will end the test sequence in this case.
6.3.6 Disconnect()
It is called at the closing of ValiFrame. The driver should set the instruments
to default values and disconnect from the instruments. An example project
is available on the BitifEye webpage.
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6.4 IBerReader
ValiFrame cannot integrate all possible instruments and custom interfaces
to communicate with the DUT. To overcome this problem, a .NET DLL can be
provided which implements the IBerReader interface. This DLL is used by
ValiFrame, and is invoked during the test; the DLL then takes care of the
instrument or DUT communication. To use this feature, in ValiFrame SATA
set either "Tx BIST Control", "Rx BIST Control", or "Error Detector" in the
station configurator to "Custom DLL" (see Figure 6-5). ValiFrame will search
for a file named SataCustomBerReader.dll in its installation folder.
SATA-specific calling conventions:

Connect(string)
The string parameter is an empty string by default. It can be
changed by setting the "Custom BER Reader Address" property in
the root node of the SATA test tree.
This is used to do general initialization or start external programs, if
it required.

Disconnect()
This method will be called every time a test run is finished (after all
selected tests are done, not after each individual test).
It is used to clean up or shut down external programs, if applicable.

Init(string)
This will be called when the DUT needs to be put into a specific
state. For receiver tests this will always be "BIST-L".
For transmitter tests it will also always be "BIST-L" if the tests are
set to run in that mode. If the transmitter tests are set to run in
"BIST T" mode the string will contain the short name of the pattern
needed for the test (LBP, LFTP, MFTP, HFTP, LTTP, HTTP, LFSCP,
SSOP, or COMP).
For OOB tests the input string will be "OOB", which signals the DUT
should be in neither BIST-T nor BIST-L mode. While the OOB tests
are not transmitter tests in a strict sense they are also implemented
in the scope app, and thus the "Tx BIST Control" setting in the
Station Configurator controls if the custom DLL is used for them.
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Figure 6-5: Custom DLL Selection
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6.4.1 IBerReader Interface
using System;
using System.Collections.Generic;
using System.Text;
namespace BitifEye.ValiFrame.Instruments
{
public interface IBerReader
{
/// <summary>
/// This method is called to connect to your BER reader.
/// </summary>
/// <param name="address">The address string can be used by your
implementation
/// to configure the connection to the MipiBerReader interface</param>
void Connect(string address);
/// <summary>
/// This method will be called once the connection should be closed
/// </summary>
void Disconnect();
/// <summary>
/// This method will be called prior to individual tests to tell the
device
/// what mode is tested. This can be used to load appropriate setups.
/// </summary>
/// <param name="mode"> configuration mode in which the DUT will be
tested</param>
void Init(string mode);
/// <summary>
/// Will be called at the beginning of the BER measurement and allows to
/// implement a reset for a DUT.
/// </summary>
void ResetDut();
/// <summary>
/// Start the counters. This method MUST reset the counters!
/// </summary>
void Start();
/// <summary>
/// Stop the DUT to read out the counters (see
/// GetReadCounterWithoutStopSupported()).
/// </summary>
void Stop();
/// <summary>
/// This method should return counters, on counting the
bits/frames/lines
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/// or bursts and on counting the errors detected by the
MipiBerReader.
/// The automation software will compute the BER using the following
/// equation BER=errorCounter/bitCounter. If bitCounter stays at 0, even
/// if the stimulus is sending data then this will also be interpreted
as fail.
/// </summary>
/// <param name="bitCounter"> Contains the number of bits which are
received
/// by the DUT. If it is not possible to count bits the value can also
contain
/// frames or bursts. It is just a matter of the value defined as target
BER.
/// If it is not possible to get the number of bits/frames/bursts then
the
/// method can return a value of -1 and the automation software can
compute
/// the number of bits by the data rate and the time of running.</param>
/// <param name="errorCounter"> Total number of errors since the last
start.
/// </param>
void GetCounter(out double bitCounter, out double errorCounter);
/// <summary>
/// This method should return a Boolean value depending if the device
supports
/// reading the counters while it is running or not. In case of this
method
/// returns a false then the device needs to be stopped for reading the
counters.
/// In this case the automation software will stop data transmission
/// before calling the GetCounter() function, and starting the
system after
/// that again
/// </summary>
/// <returns> false if device needs to be stopped before reading the
counters,
/// and true if the counters can be read on the fly.</returns>
bool GetReadCounterWithoutStopSupported();
/// <summary>
/// This number is used to check if all frames were counted, because
from the
/// data rate divided by BitsPerFrame the number of frames can be
computed and
/// compared with the number given by the bit counter / frame counter
resulted
/// by the GetCounter() function. If this property is one the bit
counter
/// is exactly a bit counter and not a frame counter.
/// If this number is -1 then the bits per frame is not defined
/// </summary>
Double BitsPerFrame {set; get;}
/// <summary>
/// This number is used to compute the BER out of the bit counter of
///
148
the
GetCounter()
function.
This
number
can
be
smaller
then
the
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Appendix
BitsPerFrame
/// because if the error counter is resulted from the checksum
/// then only the payload will be taken into account.
/// if this property is -1 then the counted bits per frame will be
/// estimated by test automation.
/// </summary>
double CountedBitsPerFrame {set; get;}
}
}
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This information is subject to change without notice.
© Keysight Technologies 2014
Edition 2.0, October 2014
www.keysight.com
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