Evaluation of Transmittance Dependence on Incident Angle in Glass Plate Coated with TCO Film used for Thin Film Solar Cell

Evaluation of Transmittance Dependence on Incident Angle in Glass Plate Coated with TCO Film used for Thin Film Solar Cell
LAAN-A-UV-E019
Application News
Spectroph o tome t r ic An a lysis
N o . A419
Evaluation of Transmittance Dependence on Incident Angle in Glass
Plate Coated with TCO Film used for Thin Film Solar Cell
In Application News A418, we introduced the
distribution measurement of vertically-incident light
transmitted through a glass plate coated with TCO
(transparent conductive oxide) film.
Here, we looked at the irradiation of sunlight at various
■ Attachment and Sample Used for the Measurement
A variable angle absolute reflectance attachment was
used for the measurement. Fig. 1 shows a schematic
diagram of the experiment, and Fig. 2 shows a
photograph of the glass plate (5 × 5 cm, 1.1 mm thick)
coated with TCO film mounted in the instrument. The
variable angle absolute reflectance attachment is a
device that allows measurement of the absolute
reflectance at any desired angle of incidence, and also
allows measurement of transmittance. Especially,
when the sample is thin, deflection of the optical axis
due to refraction can almost always be ignored, so
transmittance measurement can be conducted at
various angles of incidence (corresponding toθ in Fig. 1).
To do this, the detector is fixed in the default position,
and the angle of the sample holder is changed for
each measurement. Since the sample and detector
are separated in this system, the transmittance that is
obtained from measurement is linear transmittance.
Transmittance is dependent on the absorption and
reflection of light with respect to the sample, but since
reflectance is dependent on the state of the polarized
light and the angle of incidence, here we conducted
the experiment separately for s polarized light and p
polarized using a polarizer. As shown in Fig. 3, the s
polarized light shows the vertically oscillating light
component with respect to the plane of incidence, and
the p polarized light shows the parallel oscillating light
component with respect to the plane of incidence. For
details regarding polarized light and the variable angle
absolute reflectance attachment, refer to Application
News A394 and A390, respectively.
angles of incidence on a solar cell, and measured the
transmittance of this light irradiated at 6 different
angles of incidence (0˚, 10˚, 20˚, 30˚, 40˚, 50˚) using
the SolidSpec-3700 UV-VIS-NIR spectrophotometer.
Sample
Fig. 2 Sample Mounted on Variable Angle Absolute Reflectance
Attachment
s polarized light
Sample
Incident plane
Polarizer
Light
Detector
Incident
light
Reflected light
p polarized light
Fig. 1 Schematic Diagram of Experiment
Fig. 3 s Polarized Light and p Polarized Light
No.A419
■ Evaluation of Transmittance Dependence on Incident Angle in Glass Plate Coated with TCO Film used for
Thin Film Solar Cell
We measured the vertical transmittance in glass plate
are shown in Fig. 7.
coated with TCO film using 6 different angles of incidence
When the angle of incidence changes, the optical path
(0˚, 10˚, 20˚, 30˚, 40˚, 50˚). Light was irradiated from the
length through the film changes, thereby causing a shift
side opposite that from the film-coated side. The results
in peak position in accordance with the interference
of measurement using the s polarized light are shown in
waveform. Looking at Fig. 7, it is evident that there are
Fig. 4, and the results of measurement using the p
alternating large and small differences in transmittance
polarized light are shown in Fig. 5. Since the reflectance
between the data sets depending on that shift in peak
at each incident angle is different for the s polarized light
position. For example, the difference in transmittance
and p polarized light, different oscillations are shown for
between the data sets in the region of 650 nm is large,
the respective types of polarized light. The waveform
but in the region of 760 nm, the difference is small.
seen in the visible region is an interference waveform
The transmittances at 650 nm and 760 nm are shown in
caused by interference due to the film. The measurement
Table 2. When evaluating the plate materials of solar
conditions are shown in Table 1.
cells, it is important to check the transmittance at various
Considering that sunlight is nonpolarized light (natural
angles, but in this experiment, the actual differences
light), we calculated the transmittance corresponding to
between the spectra have been captured.
nonpolarized light by averaging the data obtained from
Using this system in this way makes it possible to grasp
measurement of the s polarized light and p polarized
the transmittance characteristics of translucent
light. The results are shown in Fig. 6, and the results for
conductive films, photoabsorption layers, and substrate
an extended region of the spectra from 350 nm - 900 nm
materials, etc. at various angles of incidence.
0˚s
50˚p
40˚p
10˚s
30˚p
20˚s
20˚p 10˚p 0˚p
40˚s 30˚s
50˚s
Fig. 4 Transmittance Spectra Measured with s Polarized Light at
0, 10, 20, 30, 40, and 50 Degrees
0˚
10˚
Fig. 5 Transmittance Spectra Measured with p Polarized Light at
0, 10, 20, 30, 40, and 50 Degrees
20˚
0˚ 10˚
20˚
50˚ 40˚ 30˚
50˚ 40˚
30˚
650 nm
760 nm
Fig. 6 Transmittance Spectra of Nonpolarized Light Calculated
using s Polarized Spectra and p Polarized Spectra at
0, 10, 20, 30, 40, and 50 Degrees
Fig. 7 Expanded Region of Spectra of Fig. 6
Table 1 Measurement Parameters
Table 2 Transmittance at 650 nm and 760 nm
Measurement Wavelength Range : 300 nm to 1800 nm
: Medium
Scan Speed
: 1.0 nm
Sampling Pitch
: Transmittance
Photometric Value
: (20) nm
Slit Width
: 290 nm
Lamp Switching Wavelength
: 720 nm
Grating Switching Wavelength
Detector Switching Wavelength : 870 nm, 1650 nm
Transmittance at 650 nm
Transmittance at 76 nm
Angle of Incidence: 0˚
81.4
75.1
Angle of Incidence: 10˚
81.0
75.0
Angle of Incidence: 20˚
79.9
75.2
Angle of Incidence: 30˚
78.0
75.7
Angle of Incidence: 40˚
75.0
76.0
Angle of Incidence: 50˚
71.7
75.2
NOTES:
✽This Application News has been produced and edited using information that was available when the
data was acquired for each article. This Application News is subject to revision without prior notice.
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