DS1091L

DS1091L
11/5/2008
PRODUCT RELIABILITY REPORT
FOR
DS1091L, Rev A1
Maxim Integrated Products
4401 South Beltwood Parkway
Dallas, TX 75244-3292
Prepared by:
Don Lipps
Manager, Reliability Engineering
Maxim Integrated Products
4401 South Beltwood Pkwy.
Dallas, TX 75244-3292
Email: [email protected]
ph: 972-371-3739
fax: 972-371-6016
Conclusion:
The following qualification successfully meets the quality and reliability standards required of all Maxim
products:
DS1091L, Rev A1
In addition, Maxim's continuous reliability monitor program ensures that all outgoing product will
continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor
program can be viewed at http://www.maxim-ic.com/TechSupport /dsreliability.html.
Device Description:
A description of this device can be found in the product data sheet. You can find the product data
sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm.
Reliability Derating:
The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that
are temperature accelerated.
AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts
AfT = Acceleration factor due to Temperature
tu = Time at use temperature (e.g. 55°C)
ts = Time at stress temperature (e.g. 125°C)
k = Boltzmann’s Constant (8.617 x 10-5 eV/°K)
Tu = Temperature at Use (°K)
Ts = Temperature at Stress (°K)
Ea = Activation Energy (e.g. 0.7 ev)
The activation energy of the failure mechanism is derived from either internal studies or industry
accepted standards, or activation energy of 0.7ev will be used whenever actual failure mechanisms
or their activation energies are unknown. All deratings will be done from the stress ambient
temperature to the use ambient temperature.
An exponential model will be used to determine the acceleration factor for failure mechanisms, which
are voltage accelerated.
AfV = exp(B*(Vs - Vu))
AfV = Acceleration factor due to Voltage
Vs = Stress Voltage (e.g. 7.0 volts)
Vu = Maximum Operating Voltage (e.g. 5.5 volts)
B = Constant related to failure mechanism type (e.g. 1.0, 2.4, 2.7, etc.)
The Constant, B, related to the failure mechanism is derived from either internal studies or industry
accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are
unknown. All deratings will be done from the stress voltage to the maximum operating voltage.
Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the
60% or 90% confidence level (Cf).
The failure rate, Fr, is related to the acceleration during life test by:
Fr = X/(ts * AfV * AfT * N * 2)
X = Chi-Sq statistical upper limit
N = Life test sample size
Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate
is related to MTTF by:
MTTF = 1/Fr
NOTE: MTTF is frequently used interchangeably with MTBF.
The calculated failure rate for this device/process is:
FAILURE RATE:
MTTF (YRS):
43508
FITS:
2.6
DEVICE HOURS:
370272
FAILS:
0
Only data from Operating Life or similar stresses are used for this calculation.
The parameters used to calculate this failure rate are as follows:
Cf: 60%
Ea: 0.7
B: 0
Tu: 25
°C
Vu: 3.6
Volts
The reliability data follows. At the start of this data is the device information. The next section is the
detailed reliability data for each stress. The reliability data section includes the latest data available and
may contain some generic data. "*" after DATE CODE denotes specific product data and SEQ No. to
identify specific line items in the report for comments when required.
Device Information:
Process:
E35X3P3M,DPE2,CrSi,DSD,PDESD,PDRES,Cap,ENPN,DPT,HTO,SgHalo
TEOS Ox-Nit Passivation for E35X; Full BEOL at SA; PT
only in Dallas
55 x 56
4887
Aluminum / 0.5% Copper
120 Å
Passivation:
Die Size:
Number of Transistors:
Interconnect:
Gate Oxide Thickness:
ELECTRICAL CHARACTERIZATION
DESCRIPTION
DATE CODE/SEQ CONDITION
READPOINT
QTY FAILS
ESD SENSITIVITY
0719
*2
EOS/ESD S5.1 HBM 500 VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0719
*3
EOS/ESD S5.1 HBM 1000 VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0719
*4
EOS/ESD S5.1 HBM 2000 VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0719
*5
EOS/ESD S5.1 HBM 3000 VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0719
*6
EOS/ESD S5.1 HBM 4000 VOLTS
1
PUL'S
3
1
LATCH-UP
0719
*7
JESD78, I-TEST 125C
6
0
LATCH-UP
0719
*8
JESD78, V-SUPPLY TEST 125C
6
0
ESD SENSITIVITY
0719
*9
JESD22-C101 CDM 200 VOLTS
3
PUL'S
3
0
ESD SENSITIVITY
0719
* 10
JESD22-C101 CDM 500 VOLTS
3
PUL'S
3
0
ESD SENSITIVITY
0719
* 11
JESD22-C101 CDM 750 VOLTS
3
PUL'S
3
0
ESD SENSITIVITY
0719
* 12
JESD22-C101 CDM 1000 VOLTS
3
PUL'S
3
0
ESD SENSITIVITY
0719
* 13
JESD22-C101 CDM 2000 VOLTS
3
PUL'S
3
3
ESD SENSITIVITY
0719
* 14
JESD22-A115 MM 50 VOLTS
1
PUL'S
3
0
FA#
No FA
No FA
ESD SENSITIVITY
0719
* 15
JESD22-A115 MM 100 VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0719
* 16
JESD22-A115 MM 200 VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0719
* 17
JESD22-A115 MM 400 VOLTS
1
PUL'S
3
3
No FA
7
Total:
OPERATING LIFE
DESCRIPTION
DATE CODE/SEQ CONDITION
READPOINT
HIGH TEMP OP LIFE
0632
125C, 3.6V (PSA) & 3.9V (PSB)
1000 HRS
45
0
HIGH TEMP OP LIFE
0651
125C, 3.6 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0711
125C, 3.0V (PSB) & 3.6V (PSA)
1000 HRS
45
0
HIGH TEMP OP LIFE
0715
125C, 3.6 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0719
*2
125C, 3.6 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0719
*3
125C, 3.6 VOLTS
408
HRS
32
0
HIGH TEMP OP LIFE
0732
125C, 5.5 VOLTS
408
HRS
45
0
HIGH TEMP OP LIFE
0732
125C, 5.5 VOLTS
408
HRS
32
0
HIGH TEMP OP LIFE
0745
125C, 5.5 VOLTS
240
HRS
45
0
HIGH TEMP OP LIFE
0747
125C, 3.6V (PSA) & 3.0V (PSB)
1000 HRS
45
0
HIGH TEMP OP LIFE
0827
125C, 3.6 VOLTS
1000 HRS
45
0
Total:
FAILURE RATE:
MTTF (YRS):
43508
FITS:
2.6
DEVICE HOURS:
370272
FAILS:
0
QTY FAILS
0
FA#
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