DS1050

DS1050
8/10/2007
PRODUCT RELIABILITY REPORT
FOR
DS1050, Rev A1
Dallas Semiconductor
4401 South Beltwood Parkway
Dallas, TX 75244-3292
Prepared by:
Ken Wendel
Reliability Engineering Manager
Dallas Semiconductor
4401 South Beltwood Pkwy.
Dallas, TX 75244-3292
Email : [email protected]
ph: 972-371-3726
fax: 972-371-6016
mbl: 214-435-6610
Conclusion:
The following qualification successfully meets the quality and reliability standards required of all Dallas
Semiconductor products:
DS1050, Rev A1
In addition, Dallas Semiconductor's continuous reliability monitor program ensures that all outgoing
product will continue to meet Maxim's quality and reliability standards. The current status of the
reliability monitor program can be viewed at http://www.maxim-ic.com/TechSupport /dsreliability.html.
Device Description:
A description of this device can be found in the product data sheet. You can find the product data
sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm.
Reliability Derating:
The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that
are temperature accelerated.
AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts
AfT = Acceleration factor due to Temperature
tu = Time at use temperature (e.g. 55°C)
ts = Time at stress temperature (e.g. 125°C)
k = Boltzmann’s Constant (8.617 x 10-5 eV/°K)
Tu = Temperature at Use (°K)
Ts = Temperature at Stress (°K)
Ea = Activation Energy (e.g. 0.7 ev)
The activation energy of the failure mechanism is derived from either internal studies or industry
accepted standards, or activation energy of 0.7ev will be used whenever actual failure mechanisms
or their activation energies are unknown. All deratings will be done from the stress ambient
temperature to the use ambient temperature.
An exponential model will be used to determine the acceleration factor for failure mechanisms,
which are voltage accelerated.
AfV = exp(B*(Vs - Vu))
AfV = Acceleration factor due to Voltage
Vs = Stress Voltage (e.g. 7.0 volts)
Vu = Maximum Operating Voltage (e.g. 5.5 volts)
B = Constant related to failure mechanism type (e.g. 1.0, 2.4, 2.7, etc.)
The Constant, B, related to the failure mechanism is derived from either internal studies or industry
accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are
unknown. All deratings will be done from the stress voltage to the maximum operating voltage.
Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the
60% or 90% confidence level (Cf).
The failure rate, Fr, is related to the acceleration during life test by:
Fr = X/(ts * AfV * AfT * N * 2)
X = Chi-Sq statistical upper limit
N = Life test sample size
Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT
rate is related to MTTF by:
MTTF = 1/Fr
NOTE: MTTF is frequently used interchangeably with MTBF.
The calculated failure rate for this device/process is:
FAILURE RATE:
MTTF (YRS):
192824
FITS:
0.6
DEVICE HOURS:
1641000
FAILS:
0
Only data from Operating Life or similar stresses are used for this calculation.
The parameters used to calculate this failure rate are as follows:
Cf: 60%
Ea: 0.7
B: 0
Tu: 25
°C
Vu: 5
Volts
The reliability data follows. At the start of this data is the device information. The next section is the
detailed reliability data for each stress. The reliability data section includes the latest data available and
may contain some generic data. "*" after DATE CODE denotes specific product data and SEQ No. to
identify specific line items in the report for comments when required.
Device Information:
Process:
Passivation:
Die Size:
Number of Transistors:
Interconnect:
Gate Oxide Thickness:
E6H-2P2M,HPVt,TCN1 ALOCOS:GOI 5in reticles.
Passivation w/Nov TEOS Oxide-Nitride
45 x 38
2904
Aluminum / 0.5% Copper
150 Å
ELECTRICAL CHARACTERIZATION
DESCRIPTION
DATE CODE/SEQ CONDITION
READPOINT
QTY FAILS
ESD SENSITIVITY
0125
EOS/ESD S5.1 HBM 500 VOLTS
2
PUL'S
3
0
ESD SENSITIVITY
0125
EOS/ESD S5.1 HBM 1000 VOLTS
2
PUL'S
3
0
ESD SENSITIVITY
0125
EOS/ESD S5.1 HBM 2000 VOLTS
2
PUL'S
3
0
ESD SENSITIVITY
0125
EOS/ESD S5.1 HBM 4000 VOLTS
2
PUL'S
3
0
ESD SENSITIVITY
0125
EOS/ESD S5.1 HBM 8000 VOLTS
2
PUL'S
3
3
LATCH-UP
0125
JESD78, I-TEST 85C
3
0
LATCH-UP
0125
JESD78, V-SUPPLY TEST 85C
3
0
FA#
No FA
3
Total:
OPERATING LIFE
DESCRIPTION
DATE CODE/SEQ CONDITION
READPOINT
QTY FAILS
HIGH TEMP OP LIFE
0343
125C, 5.0 VOLTS
1000 HRS
80
0
HIGH TEMP OP LIFE
0410
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0411
125C, 5.0 VOLTS
1000 HRS
80
0
HIGH TEMP OP LIFE
0414
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0418
125C, 5.0 VOLTS
1000 HRS
77
0
FA#
HIGH TEMP OP LIFE
0418
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0421
125C, 5.25 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0428
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0432
125C, 5.0 VOLTS
1000 HRS
80
0
HIGH TEMP OP LIFE
0437
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0438
125C, 5.0 VOLTS
1000 HRS
78
0
HIGH TEMP OP LIFE
0439
125C, 5.0 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0442
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0447
125C, 5.0 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0506
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0512
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0512
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0512
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0523
125C, 5.0 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0544
125C, 5.0 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0550
125C, 5.5 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0603
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0623
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0623
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0625
125C, 5.5 VOLTS
1000 HRS
45
0
HIGH TEMP OP LIFE
0630
125C, 5.5 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0644
125C, 5.25 VOLTS
1000 HRS
77
0
0
Total:
FAILURE RATE:
MTTF (YRS):
192824
FITS:
0.6
DEVICE HOURS:
1641000
FAILS:
0
Was this manual useful for you? yes no
Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

Download PDF

advertisement