datasheet for 54LS295B/BCA by Rochester Electronics

datasheet for 54LS295B/BCA by Rochester Electronics
INCH-POUND
MIL-M-38510/306E
17 June 2003
SUPERSEDING
MIL-M-38510/306D
16 NOVEMBER 1987
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL,
SHIFT REGISTERS, CASCADABLE, MONOLITHIC SILICON
Inactive for new design after 18 April 1997.
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, low power, shift register
microcircuits. Two product assurance classes and a choice of case outlines and lead finishes and are reflected in the
complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF38535, (see 6.3).
1.2 Part number. The part number should be in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types should be as follows:
Device type
01
02
03
04
05
06
07
08
09
Circuit
4 bit bi-directional shift register
4 bit parallel-access shift register
4 bit parallel-access shift register
5 bit shift register
8 bit parallel-out shift register
4 bit right-shift, left-shift register, 3-state outputs
4 bit cascadable shift register, 3-state outputs
8 bit parallel-in shift register with clock inhibit
8 bit parallel-in shift register with clear
1.2.2 Device class. The device class should be the product assurance level as defined in MIL-PRF-38535.
Beneficial comments (recommendations, additions deletions) and any pertinent data which may be used in
improving this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN:
DSCC-VAS, P.O. Box 3990, Columbus OH 43216-5000, by using the self addressed Standardization
Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
AMSC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5962
MIL-M-38510/306E
1.2.3 Case outlines. The case outlines should be as designated in MIL-STD-1835 and as follows:
Outline letter
A
B
C
D
E
F
X
2
Descriptive designator
Terminals
GDFP5-F14 or CDFP6-F14
GDFP4-14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
CQCC2-N20
CQCC1-N20
Package style
14
14
14
14
16
16
20
20
Flat pack
Flat pack
Dual-in-line
Flat pack
Dual-in-line
Flat pack
Square leadless chip carrier
Square leadless chip carrier
1.3 Absolute maximum ratings.
Supply voltage range ............................................................................. -0.5 V dc to 7.0 V dc
Input voltage range ................................................................................ -1.5 V dc at -18 mA to 5.5 V dc
Storage temperature range .................................................................... -65° to +150°C
Maximum power dissipation per register, (PD) 1/ :
Device type 01 .................................................................................. 127 mW dc
Device type 02, 03 ............................................................................ 116 mW dc
Device type 04 .................................................................................. 110 mW dc
Device type 05 .................................................................................. 149 mW dc
Device type 06, 07 ............................................................................ 160 mW dc
Device type 08 .................................................................................. 198 mW dc
Device type 09 .................................................................................. 209 mW dc
Lead temperature (soldering, 10 seconds) ............................................. 300°C
Thermal resistance, junction to case (θJC):
Cases A, B, C, D, E, F, 2, and X
(See MIL-STD-1835)
Junction temperature (TJ) 2/.................................................................... 175°C
1.4 Recommended operating conditions.
Supply voltage (VCC) ..............................................................................
Minimum high level input voltage (VIH) ...................................................
Maximum low level input voltage (VIL) ....................................................
Case operating temperature range (TC) .................................................
Minimum clock pulse width:
Device type 01, 03, 05, 07, 09...........................................................
Device type 02 ..................................................................................
Device type 04, 06, 08.......................................................................
Minimum clear pulse width:
Device type 01, 09 ............................................................................
Device type 02 ..................................................................................
Device type 04 ..................................................................................
Device type 05, 07 ............................................................................
Minimum load pulse width:
Device type 08 ..................................................................................
Minimum setup time at mode control:
Device type 01 .................................................................................
Device type 03, 06 ............................................................................
4.5 V dc minimum to 5.5 V dc maximum
2.0 V dc
0.7 V dc
-55° to +125°C
20 ns
18 ns
25 ns
20 ns
15 ns
30 ns
25 ns
30 ns
30 ns
20 ns
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening
conditions in accordance with MIL-PRF-38535.
2
MIL-M-38510/306E
Minimum setup time at shift/load:
Device type 02 ..................................................................................
Device type 07 ..................................................................................
Device type 08 ..................................................................................
Device type 09 ..................................................................................
Minimum setup time at serial data:
Device type 08 ..................................................................................
Minimum setup time at serial or parallel data:
Device type 01, 02, 03, 05, 06, 07.....................................................
Device type 04 ..................................................................................
Device type 09 ..................................................................................
Minimum setup time at preset:
Device type 04 ..................................................................................
Minimum setup time at inhibit:
Device type 08 ..................................................................................
Minimum hold time:
Device type 01, 02, 03, 04, 05, 07.....................................................
Device type 06 ..................................................................................
Device type 08 ..................................................................................
Device type 09 ..................................................................................
Minimum enable or inhibit time of clock:
Device type 03 ..................................................................................
Maximum release time shift/load:
Device type 02 ..................................................................................
25 ns
20 ns
42 ns
30 ns
10 ns
20 ns
30 ns
18 ns
30 ns
30 ns
10 ns
20 ns
3 ns
2 ns
20 ns
10 ns
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications and Standards. The following specifications and standards form a part of this specification to the
extent specified herein. Unless otherwise specified, the issues of these documents shall be those listed in the issue of the
Departments of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
MIL-STD-1835
-
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outlines
(Unless otherwise indicated, copies of the above specifications and standards are available from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein,
the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations
unless a specific exemption has been obtained.
3
MIL-M-38510/306E
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract
award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified
herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not
affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections and logic diagrams. The terminal connections and logic diagrams shall be as specified on
figure 1.
3.3.2 Truth tables. The truth tables and timing diagrams shall be as specified on figure 2.
3.3.3 Logic diagrams. The logic diagrams shall be as specified on figure 3.
3.3.4 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity (DSCC-VAS) upon request.
3.3.5 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply
over the full recommended case operating temperature range, unless otherwise specified.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in
table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 12
(see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to
qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MILPRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
4
MIL-M-38510/306E
TABLE I. Electrical performance characteristics.
Test
High-level output
voltage
Low-level output
voltage
Symbol
VOH
VOL
Device
types
Min
IOH = -1.0 mA
06,07
2.4
V
IOH = -400 µA
01,02,03
04,05,
07 (QD'),
08,09
2.5
V
IOL = 4 mA
01,02,03
04,05,
07 (QD'),
08,09
IOL = 12 mA
06,07
Conditions 1/
-55°C < TC < +125°C
unless otherwise specified
VCC = 4.5 V
VIN = 2.0 V
VCC = 4.5 V,
VIN = 0.7 V
Input clamp voltage
VIC
VCC = 4.5 V, IIN = -18 mA, TC = 25°C
High-level input
current for all
inputs except S/L
for type 08
IIH1
VCC = 5.5 V, IIN = 2.7 V
IIH2
VCC = 5.5 V, IIN = 5.5 V
High-level input
current at any
input except mode
IIH3
VCC = 5.5 V, IIN = 2.7 V
IIH4
VCC = 5.5 V, IIN = 5.5 V
High-level input
current at any
input except
preset enable
IIH5
VCC = 5.5 V, IIN = 2.7 V
IIH6
VCC = 5.5 V, IIN = 5.5 V
High-level input
current at mode
IIH7
VCC = 5.5 V, IIN = 2.7 V
IIH8
VCC = 5.5 V, IIN = 5.5 V
High-level input
current at preset
enable
IIH9
VCC = 5.5 V, IIN = 2.7 V
IIH10
VCC = 5.5 V, IIN = 5.5 V
High-level input
current at S/L
IIH11
VCC = 5.5 V, IIN = 2.7 V
IIH12
VCC = 5.5 V, IIN = 5.5 V
Limits
Unit
Max
0.4
V
All
-1.5
V
01,02,05,
06,07,08,
09
20
µA
100
03
20
µA
100
04
20
µA
100
03
40
µA
200
04
100
µA
500
08
60
300
See footnotes at end of table.
5
µA
MIL-M-38510/306E
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55°C < TC < +125°C
unless otherwise specified
Device
types
Limits
Min
Unit
Max
Off-state output
current, high
level voltage
applied
IOZH
VCC = 5.5 V, VO = 2.7 V
06,07
20
µA
Off-state output
current, low level
voltage applied
IOZL
VCC = 5.5 V, VIN = 0.4 V
06,07
-20
µA
Low-level input
current (for all
inputs except S/L,
serial in & data
for types 08
and 09)
IIL1
VCC = 5.5 V, VIN = 0.4 V
01,02,06
-.03
-.44
mA
05
-.10
-.44
07
-.03
-.40
08,09
-.001
-.72
Low-level input
current at any
input except
clock
IIL2
03
-.06
-.76
mA
Low-level input
current at any
input except
preset enable
IIL3
04
-.16
-.4
mA
Low-level input
current at clock
IIL4
03
-.03
-.44
mA
Low-level input
current at preset
enable
IIL5
04
-.6
-2.0
mA
Low-level input
current at data
and serial in
IIL6
08
-.100
-.380
mA
09
-.100
-.340
mA
Low-level input
current at S/L
IIL7
08
-.001
-1.14
mA
09
-.001
-.380
mA
01,02,03,
04,05,08,
09
-15
-100
mA
06,07
-15
-130
Short-circuit output
current
IOS
VCC = 5.5 V, VIN = 0.4 V
VCC = 5.5 V 2/
See footnotes at end of table.
6
MIL-M-38510/306E
TABLE I. Electrical performance characteristics - Continued.
Test
Supply current
Maximum shift
frequency
Propagation delay
time, low-to-high
level from clock
Symbol
ICC
fMAX
tPLH1
Conditions 1/
-55°C < TC < +125°C
unless otherwise specified
VCC = 5.5 V
VCC = 5.0 V
VCC = 5.0 V, CL = 50 pF ±10%
RL = 2 kΩ for types 01 thru 05, 08 and
09. See figures 9 and 10 for RL for
types 06 and 07
See footnotes at end of table.
7
Device
types
Limits
Min
Unit
Max
04
20
02,03
21
01
23
05
27
06
29
07
34
08
36
09
38
04
17
06
18
01,03,
05,07
20
02
25
08
20
09
20
01,02
5
mA
MHz
41
03,05
48
07
56
04
68
06
46
08
58
09
40
ns
MIL-M-38510/306E
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Propagation delay
time, low-to-high
level form preset
or preset enable
tPLH2
Propagation delay
time, high-to-low
level from clock
tPLH1
Propagation delay
time, high-to-low
level from clear
Conditions 1/
-55°C < TC < +125°C
unless otherwise specified
VCC = 5.0, CL = 50 pF ±10%
RL = 2 kΩ for types 01 thru 05, 08 and
09. See figures 9 and 10 for RL types
06 and 07
Device
types
Min
Max
02
5
53
04
01,02
tPLH2
Limits
Unit
60
5
47
03,05,07
56
04
68
06
52
08
58
09
46
01,02
ns
05
53
07
56
05
62
04
90
ns
ns
Propagation delay
time, low to high
level from S/L
tPLH5
08,09
5
52
ns
Propagation delay
time, high to low
level from S/L or
clear
tPHL5
08,09
5
52
ns
Propagation delay
time, high to low
level from data
tPHL3
08
5
46
ns
Propagation delay
time, low to high
level from data
tPLH3
08
5
39
ns
See footnotes at end of table.
8
MIL-M-38510/306E
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Propagation delay
time, low to high
level from data
tPLH4
Propagation delay
time, high to low
level from data
tPHL4
Output enable time
to low level
tZL
Output enable time
to high level
Conditions 1/
-55°C < TC < +125°C
unless otherwise specified
VCC = 5.0 V, CL = 50 pF ±10%
RL = 2kΩ for types 01 thru 05, 08 and
09. See figures 9 and 10 for RL types
06 and 07
See figures 9 and 10 for conditions
tZH
Device
types
Min
Max
08
5
46
ns
08
5
39
ns
06
5
45
ns
07
5
53
ns
06
5
39
ns
Limits
07
Output disable time
from low level
tLZ
07
53
5
06
Output disable time
from high level
tHZ
07
06
1/ Complete terminal condition shall be as specified in table III.
2/ Not more than one output should be shorted at a time.
9
Unit
53
ns
71
5
53
84
ns
MIL-M-38510/306E
TABLE II. Electrical test requirements.
MIL-PRF-38535 test requirements
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Group B test when using the method 5005
QCI option.
Group C end-point electrical
parameters
Group D end-point electrical parameters
*PDA applies to subgroup 1.
10
Subgroups (see table III)
Class S
Class B
devices
devices
1
1
1*, 2, 3, 7, 9,
10, 11
1, 2, 3, 7, 8,
9, 10, 11
1, 2, 3
9, 10, 11
1, 2, 3,
9, 10, 11
1, 2, 3
1*, 2, 3, 9
1, 2, 3, 7, 8,
9, 10, 11
N/A
1, 2, 3
1, 2, 3
MIL-M-38510/306E
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535 .
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MILPRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are
conventional and positive when flowing into the referenced terminal.
11
MIL-M-38510/306E
Device type 01
Device type 02
Device type 03
Pin
number
2, X
E,F
2, X
CASES
E,F
1
2
NC
CLEAR
NC
CLR
CLR
J
3
4
SHF RHT
SER INP
A
CLEAR
SHF RHT
SER INP
A
B
5
6
B
NC
C
D
K
A
NC
7
C
8
D
SHF LEFT
SER INP
GND
9
SHF LEFT
SER INP
GND
11
NC
CLOCK
NC
12
SO
QD
SHF/LOAD
QD
QD
13
S1
QC
CLK
QC
14
CLK
QB
QD
QB
15
16
17
18
19
20
QD
NC
QC
QB
QA
VCC
QA
VCC
QD
NC
QC
QB
QA
VCC
QA
VCC
10
Device type 04
2, X
A,B,C,
and D
2, X
E,F
NC
SER INP
SER INP
A
NC
CLK
CLK
A
A
B
A
B
A
B
C
B
C
B
C
NC
C
C
NC
VCC
D
B
D
NC
D
MODE
CONT
GND
VCC
E
C
GND
D
D
SO
D
GND
MODE
CONT
GND
PRESET
ENABLE
SER INP
S1
SHF/
LOAD
CLK
CLK 2 L
SHF LOAD
CLK1
R SHF
QD
NC
CLK 2 L
SHF/LOAD
CLK1
R SHF
QD
J
K
NC
QC
NC
QB
QA
VCC
FIGURE 1. Terminal connections.
12
E
QC
PRESET
ENABLE
NC
QE
QD
QB
SER INP
GND
QA
QE
QC
VCC
QD
QB
GND
NC
QC
QB
QA
CLR
QA
CLR
MIL-M-38510/306E
Device type 05
Device type 06
Device type 07
Device type 08
Pin
number
2, X
A,B,C,
and D
2, X
A,B,C
and D
2, X
E,F
2, X
E, F
1
NC
A
NC
SER INP
NC
CLR
NC
2
A
B
SER INP
A
CLR
SER INP
3
4
5
6
B
QA
NC
QB
QA
QB
QC
QD
A
B
NC
C
SER INP
A
B
NC
A
B
C
D
7
NC
GND
NC
B
C
D
MODE
CONT
GND
SHF
LOAD
CLOCK
E
F
NC
SHF
LOAD
CLOCK
C
G
QH
8
QC
CLK
D
D
H
GND
9
QD
CLR
QE
OUTPUT
CONT
CLK
QH
GND
LOAD
SHF
GND
QH
10
MODE
CONT
GND
OUTPUT
CONT
CLK
LOAD
SHF
GND
GND
11
12
NC
CLK
QF
QG
QD'
QD
NC
QH
13
14
15
CLR
QE
NC
QH
VCC
NC
OUTPUT
CONT
CLK
QD'
QD
SER
INP
A
B
QC
QB
QA
SER INP
A
B
16
17
18
19
QF
NC
QG
QH
QC
NC
QB
QA
NC
QC
QB
QA
CC
20
VCC
VCC
VCC
NC
C
D
CLOCK
INHIBIT
VCC
NC
OUTPUT
CONT
CLK
QD
NC
QD
QC
QB
QA
VCC
FIGURE 1. Terminal connections - Continued.
13
E
F
G
H
C
D
CLOCK
INHIBIT
VCC
MIL-M-38510/306E
Device type 09
Pin
number
2, X
E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
NC
SERIAL INPUT
A
B
C
NC
D
CLOCK INHIBIT
CLK
GND
NC
CLR
E
F
G
NC
QH
INPUT H
SHIFT LOAD
VCC
SERIAL INPUT
A
B
C
D
CLOCK INHIBIT
CLOCK
GND
CLEAR
E
F
G
OUTPUT QH
INPUT H
SHIFT LOAD
VCC
FIGURE 1. Terminal connections - Continued.
14
MIL-M-38510/306E
Device type 01
CLEAR
L
H
H
MODE
S1 S0
X
X
X
X
H
H
CLOCK
X
L'
L
H
H
L
H
H
H
L
H
H
L
↑
↑
↑
↑
↑
H
L
L
X
H
INPUTS
SERIAL
LEFT RIGHT
X
X
X
X
X
X
X
H
OUTPUTS
A
X
X
a
PARALLEL
B
C
X
X
X
X
b
c
D
X
X
d
QA
QB
QC
QD
L
QA0
a
L
QB0
b
L
QC0
c
L
QD0
d
H
QAn
QBn
QCn
X
X
X
X
X
L
X
X
X
X
L
QAn
QBn
QCn
H
X
X
X
X
X
QBn
QCn
QDn
H
L
X
X
X
X
X
QBn
QCn
QDn
L
X
X
X
X
X
X
QA0
QB0
QC0
QD0
H = high level (steady state)
L = low level (steady state)
X = irrelevant (any input, including transitions)
↑= transition from low to high level
a, b, c, d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = level of QA, QB, QC, or QD, respectively, before the
indicated steady state input conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC or QD, respectively, before the most
recent ↑ transition of the clock.
Typical clear, load, right-shift, left shift, inhibit, and clear sequences.
FIGURE 2. Truth tables and timing diagrams.
15
MIL-M-38510/306E
Device type 02
CLEAR
SHIFT/
LOAD
L
H
X
L
X
↑
INPUTS
SERIAL
J
K
X
X
X
X
H
H
L
X
X
X
H
H
L
H
H
H
L
H
H
H
H
CLOCK
↑
↑
↑
↑
OUTPUTS
PARALLEL
B
C
D
QA
QB
QC
QD
QD
X
c
X
d
L
a
L
b
L
c
L
d
H
d
X
X
X
QA0
QB0
QC0
QD0
Q D0
X
X
X
X
QA0
QA0
QBn
QCn
Q Cn
L
X
X
X
X
L
QAn
QBn
QCn
Q Cn
H
H
X
X
X
X
H
QAn
QBn
QCn
Q Cn
H
L
X
X
X
X
Q An
QAn
QBn
QCn
Q Cn
A
X
a
X
b
H = high level (steady state)
L = low level (steady state)
X = irrelevant (any input, including transitions)
↑= transition from low to high level
a, b, c, d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = level of QA, QB, QC, or QD, respectively, before the
indicated steady state input conditions were established.
QAn, QBn, QCn, = the level of QA, QB, or QC, respectively, before the most
recent transition of the clock.
Typical clear, shift, and load sequences.
FIGURE 2. Truth tables and timing diagrams - Continued.
16
MIL-M-38510/306E
Device type 03
MODE
CONTROL
H
H
H
L
L
L
↑
↓
↓
↑
↑
CLOCKS
2 (L) 1 (R)
H
X
↓
X
↓
X
L
H
↓
X
↓
X
L
L
L
L
L
H
H
L
H
H
SERIAL
X
X
X
X
H
L
X
X
X
X
X
A
X
a
QB ↑
X
X
X
X
X
X
X
X
PARALLEL
B
C
X
X
b
c
QC ↑ QD ↑
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
D
X
d
d
X
X
X
X
X
X
X
X
QA
QB
QC
QD
QA0
a
QBn
QA0
H
L
QA0
QA0
QA0
QA0
QA0
QB0
b
QCn
QB0
QAn
QAn
QB0
QB0
QB0
QB0
QB0
QC0
c
QDn
QC0
QBn
QBn
QC0
QC0
QC0
QC0
QC0
QD0
d
d
QD0
QCn
QCn
QD0
QD0
QD0
QD0
QD0
+
Shifting left requires external connection of QB to A, QC to B, and QD to C.
Serial data is entered to input D.
H = High level (steady state), L = Low level (steady state),
X = Irrelevant (any input, including transitions)
↓= Transition from high to low level, ↑= Transition from low to high level a, b, c,
d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = level of QA, QB, QC, or QD, respectively,
before the indicated steady state input conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC, or QD, respectively,
most recent ↓ transition of the clock.
FIGURE 2. Truth tables and timing diagrams - Continued.
17
MIL-M-38510/306E
Device type 04
CLEAR
L
L
H
H
H
H
H
H
PRESET
ENABLE
L
X
H
H
H
L
L
L
A
X
L
H
L
H
X
X
X
INPUTS
PRESET
B
C
X
X
L
L
H
H
L
L
L
H
X
X
X
X
X
X
D
X
L
H
L
L
X
X
X
E
X
L
H
L
H
X
X
X
CLOCK
SERIAL
QA
QB
QC
QD
QE
X
X
X
L
L
L
X
X
X
X
X
X
H
L
L
L
H
QA0
H
QA0
H
L
L
L
H
QB0
QB0
QB0
QAn
QAn
L
L
H
QC0
H
QC0
QBn
QBn
L
L
H
QD0
QD0
QD0
QCn
QCn
L
L
H
QE0
H
QE0
QDn
QDn
↑
↑
H = high level (steady state), L = low level (steady state)
X = irrelevant (any input, including transitions)
↑= transition from low to high level
QA0, QB0, etc. = the level of QA, QB, etc., respectively before the indicated
steady state input conditions were established.
QAn, QBn, etc. = the level of QA, QB, etc., respectively before the most recent
↑ transition of the clock.
Typical clear, shift, preset and shift sequences
FIGURE 2. Truth tables and timing diagrams - Continued.
18
MIL-M-38510/306E
Device type 05
CLEAR
L
H
H
H
H
INPUTS
CLOCK
A
X
X
L
X
↑
H
↑
L
↑
X
B
X
X
H
X
L
QA
L
QA0
H
L
L
OUTPUTS
QB ....
L
QB0
QAn
QAn
QAn
QH
L
QH0
QGn
QGn
QGn
H = high level (steady state), L = low level (steady state)
X = irrelevant (any input, including transitions)
↑= transition from low to high level
QA0, QB0, QH0 = the level of QA, QB, or QH, respectively, before the indicated
steady state input conditions were established.
QAn, QGn = the level of QA, or QG before the most recent ↑ transition of the
clock; indicates a one-bit shift.
FIGURE 2. Truth tables and timing diagrams - Continued.
19
MIL-M-38510/306E
Device type 06
INPUTS
MODE
CONTROL
H
H
H
L
L
L
OUTPUTS
PARALLEL
B
C
X
X
b
c
QC ↑ QD ↑
CLOCK
SERIAL
H
X
X
X
A
X
a
QB ↑
H
X
H
X
X
X
X
L
X
X
↓
↓
↓
↓
D
X
d
d
QA
QB
QC
QD
QA0
a
QBn
QB0
b
QCn
QC0
c
QDn
QD0
d
d
X
X
X
X
QA0
H
QB0
QAn
QC0
QBn
QD0
QCn
X
X
L
QAn
QBn
QCn
When the output control is low, the outputs are disabled to high impedance state.
however, sequential operation of the registers is not affected.
+
Shifting left requires external connection of QB to A, QC to B, and
QD to C. Serial data is entered to input D.
H = high level (steady state), L = low level (steady state)
X = irrelevant (any input, including transitions)
↓= transition from high to low level.
a, b, c,d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = the level of QA, QB, QC, or QD, respectively, before the
indicated steady state input conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC, or QD, respectively, before the
most recent ↓ transition of the clock.
Device type 07
INPUTS
3 STATE OUTPUTS
PARALLEL
LOAD/SHIFT
QB
QC
QD
CLEAR
CLOCK SERIAL
QA
CONTROL
A
B
C
D
L
X
X
X
X
X
X
X
L
L
L
L
H
H
H
X
X
X
X
X
QA0 QB0 QC0 QD0
↓
H
H
X
a
b
c
d
a
b
c
d
H
L
H
X
X
X
X
X
QA0 QB0 QC0 QD0
↓
H
L
H
X
X
X
X
H
QAn QBn QCn
↓
H
L
L
X
X
X
X
L
QAn QBn QCn
When the output control is low, the outputs are disabled to high impedance state.
however, sequential operation of the registers is not affected.
H = high level (steady state), L = low level (steady state),
X = irrelevant (any input, including transitions)
↓= transition from high to low level.
QA0, QB0, QC0, QD0 = the level of QA, QB, QC, or QD, respectively, before the
indicated steady state input conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC, or QD, respectively, before the
most recent ↓ transition of the clock.
FIGURE 2. Truth tables and timing diagrams - Continued.
20
CASCADE
OUTPUT
QD'
L
QD0
d
QD0
QCn
QCn
MIL-M-38510/306E
Device type 08
Inputs
Shift/
load
L
H
H
H
H
Clock
inhibit
X
L
L
L
H
Clock
Serial
X
L
X
X
H
L
X
↑
↑
X
Parallel
A....H
a.....h
X
X
X
X
Internal
Outputs
QB
QA
a
b
QA0
QB0
H
QAn
L
QAn
QA0
QB0
Output
QH
H = High level (steady state), L = Low level (steady state)
X = Irrelevant (any input, including transitions)
↑= Transition from low to high level
QA0, QB0, QH0 = the level of QA, QB, or QH, respectively, before the indicated
steady state input conditions were established.
QAn, QGn = The level of QA or QG before the most recent transition of the clock;
indicates a one-bit shift.
FIGURE 2. Truth tables and timing diagrams - Continued.
21
h
QH0
QGn
QGn
QH0
MIL-M-38510/306E
Device type 09
Clear
L
H
H
H
H
H
Shift/
load
X
X
L
H
H
X
Clock
inhibit
X
L
L
L
L
H
Clock
Serial
X
L
X
X
X
H
L
X
↑
↑
↑
↑
Parallel
A....H
X
X
a....h
X
X
X
Internal
Outputs
QB
QA
L
L
QA0
QB0
a
b
H
QAn
L
QAn
QA0
QB0
H = High level (steady state), L = Low level (steady state)
X = Irrelevant (any input, including transitions)
↑= Transition from low to high level
QA0, QB0, QH0 = the level of QA, QB, or QH respectively, before the indicated
steady state input conditions were established.
QAn, QGn = The level of QA or QG before the most recent ↑ transition of the clock;
indicates a one-bit shift.
FIGURE 2. Truth tables and timing diagrams - Continued.
22
Output
QH
L
QH0
h
QGn
QGn
QH0
MIL-M-38510/306E
FIGURE 3. Logic diagrams.
23
MIL-M-38510/306E
...
dynamic input activated from a high level to a low level
FIGURE 3. Logic diagrams - Continued.
24
MIL-M-38510/306E
FIGURE 3. Logic diagrams - Continued.
25
MIL-M-38510/306E
FIGURE 3. Logic diagram - Continued.
26
MIL-M-38510/306E
FIGURE 3. Logic diagrams - Continued.
27
MIL-M-38510/306E
Pin numbers are for cases E and F only.
FIGURE 3. Logic diagrams - Continued.
28
MIL-M-38510/306E
FIGURE 3. Logic diagrams - Continued.
29
MIL-M-38510/306E
Device Type 09
Pin numbers are for cases E and F only.
FIGURE 3. Logic diagrams - Continued.
30
MIL-M-38510/306E
FIGURE 4. Switching test circuit and waveforms for device type 01.
31
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 Mhz, tTLH ≤ 15 ns,
tTHL ≤ 6 ns, tp (clock) ≥ 20 ns.
2. Serial or data pulse characteristics: tTHL ≤ 15 ns, tTHL ≤ 6 ns,
tSETUP = 20 ns, tHOLD = 10 ns, tp (serial) or tp (data) = 30 ns.
3. Clear pulse characteristics: tTHL ≤ 15 ns, tTHL ≤ 6 ns; tp (clear) = 20 ns.
4. CL = 50 pF ±10 percent incliding scope, probe, wiring and stray
capacitance without package in test fixture.
5. All diodes are 1N3064, 1N916 or equivalent.
6. RL = 2.0 kΩ ±5percent.
7. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 4. Switching test circuit and waveforms for device type 01 - Continued .
32
MIL-M-38510/306E
FIGURE 5. Switching test circuit and waveforms for device type 02.
33
MIL-M-38510/306E
FIGURE 5. Switching test circuit and waveforms for device type 02 - Continued.
34
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns,
tTLH ≤ 6 ns, tp (clock) ≥ 18 ns.
2. Data pulse characteristics: tTLH ≤ 20 ns, tTHL ≤ 6 ns,
tSETUP = 20 ns, tHOLD = 10 ns, tDATA = 30 ns.
3. Clear pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns; tp (clear) = 15 ns.
4. CL = 50 pF ±10 percent including scope, probe, wiring and stray
capacitance without package in test fixture.
5. All diodes are 1N3064, 1N916 or equivalent.
6. RL = 2.0 kΩ ± 5 percent.
7. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 5. Switching test circuit and waveforms for device type 02 - Continued.
35
MIL-M-38510/306E
FIGURE 6. Switching test circuit and waveforms for device type 03.
36
MIL-M-38510/306E
FIGURE 6. Switching test circuit and waveforms for device type 03 - Continued.
37
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns,
tTHL ≤ 6 ns, tp (clock) ≥ 20 ns.
2. Serial data pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns,
tp (SER) or tp (DATA) = 30 ns, tSETUP = 20 ns, tHOLD = 10 ns.
3. CL = 50 pF ±10 percent including scope, probe, wiring and stray
capacitance without package in test fixture.
4. RL = 2.0 kΩ ±5%.
5. All diodes are 1N3064, 1N916 or equivalent.
6.
Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 6. Switching test circuit and waveforms for device type 03 - Continued.
38
MIL-M-38510/306E
FIGURE 7. Switching test circuit and waveforms for device type 04.
39
MIL-M-38510/306E
FIGURE 7. Switching test circuit and waveforms for device type 04 - Continued.
40
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns,
tTHL ≤ 6 ns, tp (clock) ≥ 25 ns.
2. Serial data pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns,
tp = 30 ns.
3. Clear, data, and enable pulse characteristics: tTLH ≤ 15 ns,
tTHL ≤ 6 ns, tp = 30 ns.
4. CL = 50 pF ±10 percent including scope, probe, wiring and stray
capacitance without package in test fixture.
4. RL = 2.0 kΩ ±5%.
5. All diodes are 1N3064, 1N916 or equivalent.
6. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 7. Switching test circuit and waveforms for device type 04 - Continued.
41
MIL-M-38510/306E
FIGURE 8. Switching test circuit and waveforms for device type 05.
42
MIL-M-38510/306E
FIGURE 8. Switching test circuit and waveforms for device type 05 - Continued.
43
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns,
tTHL ≤ 6 ns, tp (clock) ≥ 20 ns.
2. Clear pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp
(clear) = 30 ns.
3. Serial pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp
(serial) = 30 ns, tSETUP = 20 ns, tHOLD = 10 ns.
4. CL = 50 pF ±10 percent including scope, probe, wiring and stray
capacitance without package in test fixture.
5. RL = 2.0 kΩ ±5%.
6. All diodes are 1N3064, 1N916 or equivalent.
7. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 8. Switching test circuit and waveforms for device type 05 - Continued.
44
MIL-M-38510/306E
FIGURE 9. Switching test circuit and waveforms for device type 06.
45
MIL-M-38510/306E
Acrobat Document
FIGURE 9. Switching test circuit and waveforms for device type 06 - Continued.
46
MIL-M-38510/306E
FIGURE 9. Switching test circuit and waveforms for device type 06 - Continued.
47
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (clock) ≥ 25 ns.
2. Data or serial pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (serial) or tp (data)
= 40 ns, tSETUP = 20 ns, tHOLD = 20 ns.
3. Output control characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (control) ≥ 100 ns,
except when optional load is used, CL = 50 pF ± 10% for all tests.
4. CL = 50 pF ±10% for propagation delay, tZL, tZH, and CL = 15pF minimum for tHZ, tLZ
except when optional load is used, CL = pF ±10% for all tests.
CL includes scope probe, wiring, and stray capacitance without package in test fixture.
All diodes are 1N3064, 1N916, or equivalent.
6. RL = 680 Ω ± 5%.
7. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 9. Switching test circuit and waveforms for device type 06 - Continued.
48
MIL-M-38510/306E
FIGURE 10. Switching test circuit and waveforms for device type 07.
49
MIL-M-38510/306E
FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued.
50
MIL-M-38510/306E
FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued.
51
MIL-M-38510/306E
FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued.
52
MIL-M-38510/306E
NOTES:
1. Clock pulse characteristics: PRR ≤ 1.0 MHz, tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (clock) ≥ 20 ns.
2. Data or serial pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (serial) or tp (data)
= 30 ns, tSETUP = 20 ns, tHOLD = 10 ns.
3. Clear pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (clear) = 25 ns, except ≥ 200 ns
for tZL test.
4. Output control pulse characteristics: tTLH ≤ 15 ns, tTHL ≤ 6 ns, tp (control) ≥ 100 ns.
5. CL = 50 pF ±10% for propagation delay, tZH, tZL test, and CL = 15 pF minimum (all except
QD,) for tHZ, tLZ tests except when optional load is used, CL = 50 pF ±10% for all tests.
CL includes scope probe, wiring, and stray capacitance without package in test fixture.
6. All diodes are 1N3064, 1N916, or equivalent.
'
7. RL = 680 Ω ± 5% except for QD , RL = 2 kΩ ±5%.
8. Prior to initiating tests, the output shall be placed in the proper state.
FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued.
53
MIL-M-38510/306E
FIGURE 11. Switching test circuit and waveforms for device type 08.
54
MIL-M-38510/306E
FIGURE 11. Switching test circuit and waveforms for device type 08 - Continued.
55
MIL-M-38510/306E
NOTES:
1. For tPHL2 measurements, internal output G must be set to a low and QH to a high prior
to tests.
2. For tPHL2 measurements, internal output G must be set to a high and QH to a low prior
to test.
3. RL = 2.0 kΩ ±5%.
4. CL = 50 pF ±10%, which includes probe, and jug capacitance.
5. All pulse generators have the following characteristics: ZOUT ≈ 50Ω, t0 ≤ 15 ns,
t1 ≤ 6 ns and PRR ≤ 1 MHz.
6. All diodes 1N3064 or equivalent.
FIGURE 11. Switching test circuit and waveforms for device type 08 - Continued.
56
MIL-M-38510/306E
FIGURE 12. Switching test circuit and waveforms for device type 09.
57
MIL-M-38510/306E
NOTES:
1. RL = 2.0 kΩ ±5%.
2. CL = 50 pF ±10%, which includes probe, and jug capacitance.
3. All pulse generators have the following characteristics: ZOUT ≈ 50Ω, t0 ≤ 15 ns,
t1 ≤ 6 ns and PRR ≤ 1 MHz.
4. All diodes 1N3064 or equivalent.
FIGURE 12. Switching test circuit and waveforms for device type 09 - Continued.
58
See footnotes at end of device types 01.
16
20
VCC
Measured
terminal
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
QA
QB
QC
QD
QA
QD
QA
QA
QB
QC
QD
QA
QD
CLR
S/R
AIN
BIN
CIN
DIN
S/L
S0
S1
CLK
CLR
S/R
AIN
BIN
CIN
DIN
S/L
S0
S1
CLK
CLR
S/R
AIN
BIN
CIN
DIN
S/L
S0
S1
CLK
Test
Limits
Min
Max
2.5
"
"
"
"
"
"
0.4
"
"
"
"
"
-1.5
"
"
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
"
Unit
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µΑ
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
59
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
MILCases E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Subgroup Symbol STD- Cases 2,X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
883
Test no.
CLR
S/R
AIN
BIN
CIN
DIN
S/L
GND
S0
S1
CLK
QD
QC
QB
QA
method
Serial
Serial
1
VOH
3006
1
A
GND
2.0 V
GND
GND
GND
GND
GND
4.5 V
4.5 V
A 1/
-.4 mA
2
"
"
GND
2.0 V
GND
GND
"
"
"
"
"
-.4 mA
Tc = 25°C
3
"
"
"
GND
2.0 V
GND
"
"
"
"
"
-.4 mA
4
"
"
"
"
GND
2.0 V
"
"
"
"
"
-.4 mA
5
"
2.0 V
"
"
GND
GND
"
"
"
0.7 V
"
-.4 mA
6
"
GND
"
"
GND
GND
2.0 V
"
0.7 V
4.5 V
"
-.4 mA
7
"
2.0 V 2.0 V
2.0 V
2.0 V
2.0 V
2.0 V
"
4.5 V
GND
"
-.4 mA
VOL
3007
8
"
4.5 V 0.7 V
4.5 V
4.5 V
4.5 V
4.5 V
"
"
4.5 V
"
4 mA
9
"
"
4.5 V
0.7 V
4.5 V
4.5 V
"
"
"
"
"
4 mA
10
"
"
"
4.5 V
0.7 V
4.5 V
"
"
"
"
"
4mA
11
"
"
"
"
4.5 V
0.7 V
"
"
"
"
"
4 mA
12
"
0.7 V
"
"
4.5 V
4.5 V
"
"
"
0.7 V
"
4 mA
13
"
4.5 V
"
"
4.5 V
4.5 V
0.7 V
"
0.7 V
4.5 V
"
4 mA
VIC
14
-18 mA
"
15
-18 mA
"
16
-18 mA
"
17
-18 mA
"
18
-18 mA
"
19
-18 mA
"
20
-18 mA
"
21
"
-18 mA
22
"
-18 mA
23
"
-18 mA
IIH1
3010
24
2.7 V
"
25
2.7 V
"
GND
4.5 V
26
2.7 V
"
"
GND
27
2.7 V
"
"
"
28
2.7 V
"
"
"
29
2.7 V
"
"
"
30
2.7 V
"
4.5 V
"
31
"
2.7 V
32
"
2.7 V
33
GND
"
2.7 V
IIH2
34
5.5 V
"
5.5 V
35
5.5 V
"
GND
4.5 V
36
5.5 V
"
GND
GND
37
5.5 V
"
"
"
38
5.5 V
"
"
"
39
5.5 V
"
:"
"
40
5.5 V
"
4.5 V
"
41
"
5.5 V
"
42
"
5.5 V
43
GND
"
5.5 V
Subgroup Symbol
1
Tc = 25°C
IIL1
IIL2
IIL3
IIL3
IIL4
I0S
ICC
MIL-STD883
Cases E, F
Cases 2, X *
1
2
2
3
S/R
Serial
method
Test no.
CLR
3009
44
45
46
47
48
49
50
51
52
53
54
55
56
57
0.4 V
4.5 V
A
"
"
"
58
5.5 V
3011
3005
TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
3
4
5
6
7
8
9
10
11
12
4
5
7
8
9
10
12
13
14
15
AIN
BIN
CIN
DIN
S/L
Serial
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
5.5 V
4.5 V
GND
"
"
GND
4.5 V
GND
GND
GND
GND
4.5 V
GND
GND
GND
GND
4.5 V
"
GND
GND
GND
GND
S1
4.5 V
"
"
"
"
GND
0.4 V
GND
4.5 V
"
"
"
"
CLK
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
4.5 V
"
"
"
0.4 V
A 1/
"
"
"
"
5.5 V
5.5 V
"
5.5 V
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C, and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C, and VIC tests are omitted.
QD
14
18
15
19
16
20
QC
QB
QA
VCC
0.4 V
GND
GND
5.5 V
"
"
"
"
"
"
"
"
"
GND
"
GND
"
"
"
"
Measured
terminal
CLR
S/R
AIN
BIN
CIN
DIN
S/L
S0
S1
CLK
QA
QB
QC
QD
VCC
Test Limits
Unit
Min
Max
2/
"
"
"
"
"
"
"
"
"
-15
"
"
"
2/
"
"
"
"
"
"
"
"
"
-100
"
"
"
mA
"
"
"
"
"
"
"
"
"
"
"
"
"
23
"
60
MIL-M-38510/306E
2
See footnotes at end of device type 01.
S0
13
17
TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup
7
TC = 25°C
Truth
table
test
MIL-STD883
method
3014
Cases E,F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Cases 2,X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
S/R Serial
B
B
B
C
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
AIN
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
C
BIN
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
C
CIN
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
C
DIN
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
C
S/L Serial
B
B
B
C
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
S0
C
C
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
S1
C
C
C
B
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
C
C
C
B
"
"
"
"
"
"
"
"
C
"
"
"
"
CLK
C
B
C
C
B
C
C
B
C
C
B
C
C
B
C
B
C
B
C
B
C
C
B
C
B
C
B
C
B
C
C
B
C
B
C
B
C
B
C
C
B
C
C
B
C
B
C
B
C
B
C
C
B
C
C
B
QD
L
"
"
"
"
"
"
H
H
H
L
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
L
L
H
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
QC
L
"
"
"
"
"
"
H
H
H
L
"
"
"
"
"
"
H
H
"
"
"
"
"
"
"
L
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
QB
L
"
"
"
"
"
"
H
H
H
L
"
"
"
"
H
H
H
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
QA
L
"
"
"
"
"
"
H
H
H
L
L
L
H
"
"
"
"
"
"
"
"
L
VCC
5.0V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
terminal
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Test no.
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
97A
97B
97C
98
99
100
101
102
103
104
105
106
107
108
109
110
111
See footnotes at end of device type 01.
CLR
C
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
Test Limits
Unit
Min
Max
See B, C, D, and E
MIL-M-38510/306E
61
-
Symbol
TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup
8
9
TC = 25°C
Symbol
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
method
Test no.
CLR
S/R
Serial
AIN
BIN
CIN
DIN
S/L
Serial
GND
S0
S1
CLK
QD
QC
QB
QA
VCC
GND
G
G
IN
OUT
5.0 V
CLK to QA
22
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
G
"
"
"
"
GND
G
"
"
"
"
"
"
"
GND
G
"
"
"
"
GND
G
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QA
CLK TO QD
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QA
CLK TO QD
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
5
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Min
Unit
Max
Same tests, terminal conditions, and limits as subgroup 7, except TC = 125°C and -55°C
fMAX
See F
and J
tPHL1
112
G
IN
3003
(Fig. 4)
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
"
"
"
"
"
"
"
"
"
"
"
"
IN
"
"
"
IN
62
fMAX
See F
and J
3003
(Fig. 4)
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
G
G
G
G
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
129
MHz
27
"
"
"
"
"
31
"
"
"
"
"
35
"
"
"
20
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MHz
Same tests and terminal conditions as for subgroup 9
tPHL1
130 to 135
5
41
ns
tPHL1
136 to 141
5
47
ns
tPHL2
142 to 145
5
53
ns
Same tests, terminal conditions, and limits as subgroups 10, except TC = -55°C.
See footnotes at end of device type 01.
MIL-M-38510/306E
(Fig. 4)
tPHL2
11
Test Limits
Cases E, F
Cases 2, X
tPHL1
10
TC = 25°C
Measured
terminal
MIL-STD883
FOOTNOTES:
A. Apply input pulse:
2.5 V minimum/5.5 V maximum
0V
B. VIN = 2.5 V.
C. VIN = 0.4 V.
D. Test numbers 59 through 111 shall be run in sequence.
E. Output voltages shall be either: (1) H ≥2.5 V minimum and L ≤0.4 V maximum when using a high speed checker double comparator: (2) H ≥1.5 V and L <1.5 V when using a high
speed checker single comparator.
F. fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency shall be one-half of the clock input frequency. The input frequency on the AIN data shall
be one-half of the clock input frequency and the AIN shall be shifted such that the AIN ↑ and ↓ are coincident with the clock ↓ . Rise and fall times ≤ 6 ns. Input peak voltage 3 to 5
volts.
G. 3.0 V minimum/5.0 V maximum.
63
1/ This pulse must occur after the clear pulse.
2/ IIL limits (mA) min/max values for circuits shown:
Parameter
IIL1
IIL2
IIL3
IIL4
Terminal
CLR
S/R, AIN, BIN
CIN, DIN, S/L
S0, S1
CLK
A
-.16/-.4
"
B
-.11/-.35
-.11/-.35
C
-.16/-.4
"
D
-.12/-.35
-.16/-.4
E
-.12/-.36
-.105/-.345
F
-.12/-.36
"
G
-.16/-.4
"
"
"
-.03/-.3
-.03/-.3
"
-.20/-.44
-.12/-.36
-.12/-.36
-.12/-.36
-.12/-.36
"
"
"
-.15/-.38
MIL-M-38510/306E
J. At the manufacturer's option, the following alternate procedure may be used to guarantee fMAX. Serial mode - fMAX for the serial mode shall be guaranteed by clocking the device four
times (after reset) at fMAX and looking for the QD output to toggle within three periods (3 x 1/ fMAX) plus allowed propagation delay. Two tests are performed, depending on the state of
the data input, to guarantee both LH and HL transition of the output pulse.
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup
Symbol
1
VOH
Tc = 25°C
VOL
MIL-STD- Cases E,F
883
Cases 2,X
method
Test no.
3005
1
B
2.0 V
2.0 V
2.0 V
2.0 V
2.0 V
0.7 V
GND
9
12
Shift
Load
0.7 V
3007
2
3
4
5
6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.7
"
"
"
"
0.7
"
"
"
"
0.7
2.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
7
8
9
10
11
12
13
"
"
"
"
-18 mA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.7
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
VIC
IIH2
3010
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
See footnotes at end of device types 02.
2
3
J
3
4
X
4
5
AIN
5
7
BIN
6
8
CIN
7
9
DIN
8
10
GND
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
"
"
"
"
"
"
"
"
10
13
CLK
QD
B 1/
-.4 mA
-18 mA
-18 mA
GND
GND
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
2.7 V
"
"
"
"
"
"
4.5 V
"
"
"
5.5 V
A
2.7 V
GND
GND
A
5.5 V
11
14
12
15
QD
13
17
QC
14
18
QB
15
19
QA
-.4 mA
-.4 mA
-.4 mA
-.4 mA
4 mA
4 mA
4 mA
4 mA
4 mA
16
20
VCC
Measured
terminal
4.5 V
QD
2.5
V
"
"
"
"
"
QD
QC
QB
QA
"
"
"
"
0.4
"
"
"
"
"
"
"
"
"
-1.5
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
QD
QD
QC
QB
QA
CLR
J
K
AIN
BIN
CIN
DIN
Shift load
CLK
CLR
J
K
AIN
BIN
CIN
DIN
Shift load
CLK
CLR
J
K
AIN
BIN
CIN
DIN
Shift load
CLK
Test
Limits
Min
Max
Unit
MIL-M-38510/306E
64
IIH1
14
15
16
17
18
19
20
21
22
1
2
CLR
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup Symbol
1
Tc = 25°C
IIL1
I0S
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
K
AIN
BIN
CIN
DIN
GND
Shift
Load
CLK
QD
QD
QC
QB
QA
VCC
method
Test no.
CLR
J
3009
38
39
40
0.4 V
B
B
0.4 V
3011
41
42
43
44
45
46
47
GND
3005
3005
48
49
50
51
52
53
4.5 V
"
"
"
B
4.5 V
GND
"
"
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
4.5 V
"
"
"
"
"
4.5 V
"
"
"
"
"
4.5 V
"
"
"
"
"
4.5 V
"
"
"
"
"
1/
A or B
"
"
"
"
"
"
"
4.5 V
0.4 V
4.5 V
"
"
"
"
"
"
GND
"
"
"
"
"
B
"
"
"
4.5 V
B
65
2
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C, and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C, and VIC tests are omitted.
See footnotes at end of device type 02.
4.5 V
4.5 V
GND
"
"
"
0.4 V
GND
GND
GND
GND
GND
Measured
terminal
5.5 V
"
"
CLR
J
"
"
"
"
"
"
"
AIN
BIN
CIN
DIN
Shift load
CLK
"
"
"
"
"
"
K
QD
QD
QC
QB
QA
VCC
VCC
Test Limits
Unit
Min
Max
2/
"
"
2/
"
"
mA
"
"
"
"
"
"
"
"
-15
"
"
"
"
"
"
-100
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
21
21
"
"
"
"
"
”
MIL-M-38510/306E
ICC
MIL-STD- Cases E, F
883
Cases 2, X
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup
7
TC = 25°C
Symbol
Truth
table
test
MIL-STD883
method
3014
9
TC = 25°C
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Cases 2,X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Test no.
CLR
J
AIN
BIN
CIN
DIN
GND
CLK
QD
QC
QB
QA
VCC
terminal
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
D
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
D
D
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
D
"
"
"
"
"
C
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
C
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
C
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
C
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Shift
Load
D
D
D
C
C
D
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
H
H
H
L
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
H
H
L
L
L
H
H
L
L
H
L
"
"
"
"
"
H
H
H
L
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
H
H
L
L
H
H
H
L
L
H
H
H
L
"
"
"
"
"
H
H
H
L
"
"
"
"
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
H
H
L
L
H
H
L
L
L
H
"
"
"
"
L
"
"
"
"
"
H
H
H
L
L
L
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
H
H
L
L
H
H
L
L
H
H
"
"
"
"
"
"
5.0V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
All
outputs
GND
"
"
"
"
IN
"
"
"
"
OUT
IN
IN
GND
"
"
"
"
5.0 V
"
"
"
"
QA
QB
QC
QD
K
C
C
D
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
D
"
"
"
"
"
C
D
D
C
D
D
C
D
C
D
C
D
C
D
D
C
D
C
D
C
D
C
D
D
C
D
C
D
C
D
C
D
C
D
D
C
D
C
D
C
QD
H
"
"
"
"
"
L
L
L
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
H
H
"
"
"
"
"
"
"
L
L
H
H
H
L
L
H
H
L
Test
Limits
Min
Unit
Max
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
See C, D, E, and F
MIL-M-38510/306E
66
8
Cases E,F
Same tests, terminal conditions, and limits as subgroup 7 except TC = 125°C and -55°C.
fMAX
See G
(Fig. 5)
100
101
102
103
104
See footnotes at end of device type 02.
J
"
"
"
"
IN
IN
IN
OUT
OUT
OUT
OUT
Q D
27
"
"
"
"
MHz
"
"
"
"
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
9
TC = 25°C
Symbol
tPHL1
tPHL1
tPHL2
10
fMAX
TC = 125°C See G
11
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
AIN
BIN
CIN
DIN
GND
CLK
QD
QD
QC
QB
QA
VCC
GND
"
Shift
load
J
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
"
J
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
IN
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
J
J
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
method
Test no.
CLR
J
K
3003
(Fig. 5)
105
106
J
"
107
108
109
"
"
"
J
See
Fig. 5
"
"
"
J
See
Fig. 5
"
"
"
110
111
112
113
114
115
116
"
"
"
"
"
"
"
117
IN
IN
IN
IN
IN
"
GND
See
Fig. 5
"
GND
See
Fig. 5
"
118
119
"
"
"
"
"
"
120
121
122
123
124
"
"
"
"
"
IN
125
126
127
128
129
IN
"
"
"
"
J
IN
IN
J
J
IN
"
OUT
OUT 5.0 V
"
OUT
"
"
"
OUT
OUT
Max
CLK to QA
CLK TO QB
5
"
27
"
ns
"
CLK TO QC
CLK TO QD
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
31
"
"
"
"
"
"
"
"
OUT
"
"
"
CLK TO QC
"
"
"
CLK TO QD
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
35
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
"
"
OUT
OUT
"
"
"
"
"
OUT
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
Min
CLK TO Q D
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QD
CLK TO QA
CLK TO QB
OUT
OUT
Unit
"
"
"
"
OUT
OUT
Test Limits
OUT
OUT
OUT
Measured
terminal
CLK TO Q D
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO Q D
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLR TO Q D
130 to 134
25
tPLH1
135 to 144 Same tests and terminal conditions as for subgroup 9
5
41
ns
tPHL1
145 to 154
"
47
"
tPHL2
155 to 158
"
53
"
tPHL2
159
"
53
"
Same tests, terminal conditions, and limits as subgroups 10, except TC = -55°C.
See footnotes at end of device type 02.
MHz
MIL-M-38510/306E
67
tPHL2
MIL-STD- Cases E, F
883
Cases 2, X
FOOTNOTES:
A. Apply input pulse:
2.5 V minimum/5.5 V maximum
0V
B. Apply input pulse:
2.5 V minimum/5.5 V maximum.
0V
C. VIN = 2.5 V.
D. VIN = 0.4 V.
E. Test numbers 54 through 99 shall be run in sequence.
F. Output voltages shall be either: (1) H ≥2.5 V minimum and L ≤0.4 V maximum when using a high speed checker double comparator; (2) H ≥1.5 V and L <1.5 V when using a high
speed checker single comparator.
J. 3.0 V minimum/5.0 V maximum.
68
1/ This pulse must occur after the clear pulse.
2/ IIL limits (mA) min/max values for circuits shown:
Parameter
IIL1
Terminal
CLR
J, K, AIN,
BIN, CIN, DIN
Shift load
CLK
A
-.16/-.4
"
B
-.11/-.35
-.16/-.4
C
-.16/-.4
"
D
-.12/-.35
-.16/-.4
E
-.12/-.36
-.105/-.345
F
-.12/-.36
"
G
-.16/-.4
"
"
"
-.08/-.3
-.03/-.3
"
-.20/-.44
-.12/-.36
-.12/-.36
-.12/-.36
-.12/-.36
"
"
"
-.15/-.38
MIL-M-38510/306E
G. fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency shall be one-half of the input clock frequency. The input frequency on the parallel input
shall be one-half of the clock input frequency and the parallel input shall be shifted such that the parallel input ↑ and ↓ are coincident with the clock ↓ . Rise and fall times ≤ 6 ns.
Input peak voltage 3 to 5 volts.
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
MILSTD883
Symbol
method
1
VOH
Tc = 25°C
VOL
3006
3007
VIC
69
IIH4
3010
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
Serial
3
AIN
4
BIN
5
CIN
8
DIN
9
Mode
10
GND
12
CLK2
13
CLK1
14
QD
16
QC
18
QB
19
QA
20
VCC
Measured
terminal
2.0 V
GND
2.0 V
"
"
"
4.5 V
0.7 V
"
"
"
GND
2.0 V
"
"
"
4.5 V
0.7 V
"
"
"
GND
2.0 V
"
"
"
4.5 V
0.7 V
"
"
"
GND
2.0 V
"
"
"
4.5 V
0.7
"
"
"
0.7 V
2.0 V
"
"
"
0.7 V
2.0 V
"
"
"
GND
A
"
"
"
GND
A
"
"
"
A
GND
"
"
"
A
GND
"
"
"
-.4 mA
-.4 mA
4.5 V
GND
"
"
"
4.5 V
4.5 V
4.5 V
GND
"
"
"
4.5 V
4.5 V
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
QA
QA
QB
QC
QD
QA
QA
QB
QC
QD
Serial
AIN
BIN
CIN
DIN
Mode
CLK2
CLK1
Serial
AIN
BIN
CIN
DIN
CLK2
CLK1
Serial
AIN
BIN
CIN
DIN
CLK2
CLK1
0.7 V
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
-18 mA
-18 mA
2.7 V
2.7 V
5.5 V
5.5 V
-.4 mA
-.4 mA
-.4 mA
4 mA
4 mA
4 mA
4 mA
4 mA
Limits
Unit
Min
2.5
"
"
"
"
"
Max
0.4
"
"
"
"
-1.5
"
"
"
"
"
"
"
20
"
"
"
"
"
"
100
"
"
"
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µΑ
"
"
"
"
"
"
"
"
"
"
"
"
"
IIH7
33
2.7 V
"
GND
"
Mode
40
"
IIH8
34
5.5 V
"
GND
"
Mode
200
"
See footnotes at end of device types 03.
MIL-M-38510/306E
IIH3
Cases
A,B,C,D
Cases 2,X
Test no.
TABLE III. Group A inspection for device type 03 - Continued
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
1
Tc = 25°C
Symbol
MIL-STD883
IIL2
method
3009
IIL4
I0S
3005
Test no.
35
36
37
38
39
40
41
42
43
44
45
46
1
2
3
4
5
6
7
12
13
14
20
3
4
5
8
9
10
12
13
14
16
18
19
BIN
CIN
DIN
GND
GND
"
"
"
"
"
"
"
"
"
"
"
CLK2
CLK1
QD
QC
QB
QA
"
4.5 V
"
"
"
4.5 V
"
"
"
4.5 V
"
"
"
4.5 V
"
"
"
Mode
GND
4.5 V
"
"
"
0.4 V
4.5 V
GND
4.5 V
"
"
"
GND
GND
GND
GND
5.5 V
0.4 V
0.4 V
0.4 V
0.4 V
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
70
See footnotes at end of device type 03.
11
AIN
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
10
2
3
3014
9
Serial
0.4 V
2
7
Truth
TC = 25°C table
test
8
B
B
"
"
"
"
"
"
"
"
"
"
"
"
B
B
B
C
C
B
C
"
"
"
"
"
"
"
B
B
B
C
C
B
C
"
"
"
"
"
"
"
B
B
B
C
C
B
C
"
"
"
"
"
"
"
B
B
B
C
C
B
C
"
"
"
"
"
"
"
B
"
"
"
"
C
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
4.5 V
0.4 V
A
"
"
"
0.4 V
GND
"
"
"
"
A
B
C
B
B
C
"
"
"
"
"
"
"
"
"
C
"
"
"
"
B
B
C
B
C
B
C
B
C
GND
GND
GND
X
H
H
H
L
"
"
"
"
"
"
"
"
H
X
H
H
H
L
"
"
"
"
"
"
H
H
H
X
H
H
H
L
"
"
"
"
H
"
"
"
"
VCC
5.5 V
"
"
"
"
"
"
"
GND
"
"
"
"
X
H
H
H
L
L
L
H
"
"
"
"
"
"
Measured
terminal
Serial
A
B
C
D
Mode
CLK2
CLK1
QA
QB
QC
QD
"
VCC
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
Test Limits
Unit
Min
1/
"
"
"
"
"
"
"
-15
"
"
"
Max
1/
"
"
"
"
"
"
"
-100
"
"
"
mA
"
"
"
"
"
"
"
"
"
"
"
21
"
See B,C,D, and E
MIL-M-38510/306E
ICC
3011
Cases
A,B,C,D
Cases 2, X
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
7
Truth
Tc = 25°C table
tests
method
3014
Cases
A,B,C,D
Cases 2, X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Test no.
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
Serial
B
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
AIN
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
BIN
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CIN
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
DIN
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Mode
C
"
"
"
"
"
"
"
"
"
B
C
C
B
B
C
C
B
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK2
C
B
"
"
"
"
"
"
"
C
C
C
B
B
C
C
B
B
CLK1
B
B
C
B
C
B
C
B
C
"
"
"
"
"
B
"
"
"
QD
H
"
"
"
"
"
"
"
L
"
"
"
"
"
H
"
"
"
QC
H
"
"
"
"
"
L
"
"
"
"
"
"
"
H
"
"
"
QB
H
"
"
"
L
"
"
"
"
"
"
"
"
"
H
"
"
"
QA
H
H
L
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
VCC
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
G
"
"
"
GND
G
"
"
"
GND
"
"
"
G
"
"
"
GND
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
"
"
"
OUT
5.0 V
"
"
"
"
"
"
"
"
"
"
Measured
terminal
Limits
Min
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Unit
Max
See B,C,D, and E
Same tests, terminal conditions, and limits as subgroup 7 except TC = 125°C and -55°C.
9
fMAX
TC = 25°C See F,J
(Fig. 6)
71
tPLH1
tPLH1
3003
(Fig. 6)
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
See footnotes at end of device type 03.
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
"
"
"
IN
IN
IN
IN
IN
"
"
"
OUT
OUT
OUT
IN
IN
"
"
"
OUT
OUT
OUT
OUT
OUT
IN
"
"
"
IN
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
IN
"
"
"
OUT
OUT
OUT
OUT
"
"
"
"
"
"
"
"
"
QA
QB
QC
QD
QA
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QA
CLK to QB
CLK to QC
CLK to QD
22
"
"
"
"
5
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
32
"
"
"
"
"
"
"
37
"
"
"
"
"
"
"
MHz
"
"
"
"
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
8
MIL-STD883
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
MIL-STD883
Cases
A,B,C,D
Cases 2, X
2
3
4
6
8
9
10
12
13
14
16
18
19
20
method
Test no.
Serial
AIN
BIN
CIN
DIN
Mode
GND
CLK2
CLK1
QD
QC
QB
QA
VCC
Min
Max
3003
(Fig. 6)
101 to 105
20
---
MHz
tPLH1
3003
(Fig. 6)
106 to 113 Same tests and terminal conditions as for subgroup 9.
5
48
ns
tPHL1
3003
(Fig. 6)
114 to 121
5
56
ns
Symbol
10
fMAX
Tc = 25°C See F,J
11
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Measured
terminal
Limits
Unit
Same tests, terminal conditions as subgroup 10 except TC = -55°C.
Notes:
A. Apply input pulse:
2.5 V minimum/5.5 V maximum
0V
B. VIN = 2.5 V.
D. Tests numbers 48 through 79 shall be run in sequence.
72
E. Output voltages shall be either: (1) H ≥2.5 minimum and L ≤0.4 V maximum when using a high speed
checker double comparator; (2) H ≥1.5 V and L ≤1.5 V when using a high speed checker single
comparator.
F. fMAX minimum limit specified is the frequency of the clock input pulse.
The output frequency shall be one-half of the input clock frequency. The input frequency on the
serial input shall be one-half of the clock input frequency and the input shall be shifted such that
the input ↑ and ↓ are coincident with the clock ↑ . Rise and fall times ≤ 6 ns. Input peak
voltage 3 to 5 volts.
G. 3.0 V minimum/5.0 V maximum.
J. At the manufacturer's option, the following alternate procedures may be used to guarantee fMAX:
a. Parallel mode. fMAX for the parallel mode shall be guaranteed by performing propagation
delay measurements with the clock pulse width at 1/2 x 1/fMAX. In addition to the
constraints on the clock pulse, the inputs are set to the worst-case condition for the
tset-up and thold requirements. Both positive and negative clock pulse widths shall be
tested. The five tests to justify each JAN fMAX requirement shall be used to test all
possible input/output combinations. A failing limit or nontoggle will indicate that the device
fails to function at fMAX and/or the propagation delay from input to output has exceeded the
allowed limit .
b. Serial mode. fMAX for the serial mode shall be guaranteed by clocking the device four times
(after reset) at fMAX and looking for the QD output to toggle within three periods (3 x
1/fMAX) plus allowed propagation delay. Two tests are performed, depending on the state of
data input, to guarantee both LH and HL transition of the output pulse.
MIL-M-38510/306E
C. VIN = 0.4 V.
1/ IL limits (mA) min/max values for circuits shown:
Parameter
IIL2
IIL4
Terminal
Serial A,
B, C, D
Mode
CLK2,
CLK1
A
-.16/-.4
B
-.11/-.35
C
-.16/-.4
D
-.105/-.345
"
"
-.06/-.6
-.03/-.3
-.30/-.75
-.20/-.44
-.24/-.72
-.12/-.36
E
-.12/-.35
"
"
MIL-M-38510/306E
73
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
1
VOH
Tc = 25°C
VOL
VIC
74
IIH6
5
7
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
6
8
DIN
2.0 V
"
"
"
"
"
"
"
"
"
7
9
EIN
2.0 V
"
"
"
"
"
"
"
"
"
8
10
Enable
2.0 V
"
"
"
"
0.7 V
"
"
"
"
9
12
Serial
2.0 V
"
"
"
"
-18 mA
-18 mA
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
-.4 mA
4 mA
-18 mA
GND
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
11
14
QD
-.4 mA
4 mA
-18 mA
GND
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
10
13
QE
GND
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
12
15
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
13
17
QC
14
18
QB
15
19
QA
-.4 mA
16
20
CLR
2.0 V
"
"
"
"
0.7 V
"
"
"
"
Limits
Measured
terminal
QA
-.4 mA
QB
-.4 mA
QC
QD
QE
4 mA
QA
4 mA
QB
4 mA
QC
QD
QE
CLK
AIN
BIN
CIN
DIN
EIN
Enable
Serial
-18 mA
CLR
GND
CLK
"
AIN
"
BIN
"
CIN
"
DIN
"
EIN
"
Serial
2.7 V
CLR
GND
CLK
"
AIN
"
BIN
"
CIN
"
DIN
"
EIN
"
Serial
5.5 V
CLR
Unit
Min
2.5
"
"
"
"
Max
0.4
"
"
"
"
-1.5
"
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µΑ
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IIH9
36
"
"
"
"
"
"
"
2.7 V
GND
"
GND
Enable
"
IIH10
37
"
"
"
"
"
"
"
5.5 V
GND
"
GND
Enable
500
"
38
39
40
41
42
0.4 V
4.5 V
"
"
"
4.5 V
0.4 V
4.5 V
"
"
4.5 V
4.5 V
0.4 V
4.5 V
4.5 V
4.5 V
"
"
0.4 V
4.5 V
"
"
"
"
"
4.5 V
"
"
"
0.4 V
4.5 V
"
"
"
"
4.5 V
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
CLK
AIN
BIN
CIN
DIN
1/
"
"
"
"
mA
"
"
"
"
IIL3
3009
See footnotes at end of device types 04.
1/
"
"
"
"
MIL-M-38510/306E
IIH5
1
2
3
4
MIL-STD- Cases E,F
883
Cases 2,X
2
3
4
5
method
Test no.
CLK
AIN
BIN
CIN
3006
1
2.0 V
2.0 V
2.0 V
2.0 V
2
"
"
"
"
3
"
"
"
"
4
"
"
"
"
5
"
"
"
"
3007
6
"
"
"
"
7
"
"
"
"
8
"
"
"
"
9
"
"
"
"
10
"
"
"
"
11
-18 mA
12
-18 mA
13
-18 mA
14
-18 mA
15
16
17
18
19
20
2.7 V
GND
GND
GND
21
GND
2.7 V
GND
GND
22
"
GND
2.7 V
GND
23
"
GND
2.7 V
24
"
"
"
GND
25
"
"
"
"
26
"
"
"
"
27
"
"
"
"
28
5.5 V
"
"
"
29
GND
5.5 V
"
"
30
"
GND
5.5 V
"
31
"
"
GND
5.5 V
32
"
"
"
GND
33
"
"
"
"
34
"
"
"
"
35
"
"
"
"
TABLE III. Group A inspection for device type 04 - Continued
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
1
IIL3
Tc = 25°C
Cases E,F
Cases 2, X
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
Measured
terminal
method
3009
Test no.
43
44
45
CLK
4.5 V
"
"
AIN
4.5 V
"
"
BIN
4.5 V
"
"
CIN
4.5 V
"
"
VCC
5.5 V
"
"
DIN
4.5 V
"
"
EIN
0.4 V
4.5 V
"
Enable
4.5 V
"
"
Serial
4.5 V
0.4 V
4.5 V
QE
QD
GND
GND
"
"
QC
QB
QA
CLR
4.5 V
4.5 V
0.4 V
EIN
Serial
CLR
4.5 V
Enable
"
"
"
"
"
QA
QB
QC
QD
QE
GND
VCC
B
B
B
A
A
B
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IIL5
IOS
ICC
3011
3005
46
"
"
"
"
"
"
"
0.4 V
"
"
47
48
49
50
51
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
52
3
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
75
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
See footnotes at end of device type 04.
B
A
B
"
"
"
"
"
A
B
A
B
A
B
A
B
A
B
B
A
B
A
B
A
B
A
B
A
A
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
A
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
A
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
"
Same tests, terminal conditions, and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3014
GND
"
2
7
Truth
TC = 25°C table
test
GND
GND
A
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
A
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
B
B
B
A
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
A
B
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
L
L
L
H
H
L
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
L
L
L
L
H
H
L
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
L
L
L
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
L
L
H
H
L
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
L
L
L
H
H
L
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
L
L
L
H
H
L
L
L
H
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
Test Limits
Unit
Min
1/
"
"
Max
1/
"
"
mA
"
"
"
"
"
-15
"
"
"
"
-100
"
"
"
"
"
"
"
"
"
20
"
See A,B,C, and D
MIL-M-38510/306E
MIL-STD883
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup Symbol
8
MIL-STD883
Cases E, F
Cases 2, X
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
method
Test no.
CLK
AIN
BIN
CIN
VCC
DIN
EIN
Enable
Serial
QE
QD
GND
QC
QB
QA
CLR
OUT
F
QA
20
OUT
"
"
CLK TO QA
CLK TO QB
5
"
45
"
ns
"
"
"
"
IN
"
"
"
"
"
CLK TO QC
CLK TO QD
CLK TO QE
AIN TO QA
BIN TO QB
CIN TO QC
DIN TO QD
EIN TO QE
Enable to
QA
Enable to
QB
Enable to
QC
Enable to
QD
Enable to
QE
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK to QE
CLR to QA
CLR to QB
CLR to QC
CLR to QD
CLR to QE
"
"
"
"
"
"
"
"
"
"
"
"
40
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
45
"
"
"
"
60
"
"
"
"
Measured
terminal
Test Limits
Min
Unit
Max
Same tests, terminal conditions, and limits as subgroup 7, except TC = 125°C and -55°C
9
fMAX
TC = 25°C see
note E
tPLH1
tPLH2
tPHL2
81
IN
5.0 V
GND
IN
GND
3003
(Fig. 7)
82
83
"
"
"
"
"
"
IN
See
figure 7
"
"
84
85
86
87
88
89
90
91
92
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
F
"
"
"
"
IN
93
"
94
"
95
"
"
F
96
"
"
"
97
98
99
100
101
102
103
104
105
106
IN
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
See footnotes at end of device type 04.
IN
IN
IN
F
F
F
F
F
F
IN
IN
OUT
"
"
OUT
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
F
GND
"
"
"
"
IN
"
"
"
"
F
OUT
OUT
"
F
OUT
OUT
OUT
IN
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
"
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
F
"
"
"
"
IN
"
"
"
"
MHz
MIL-M-38510/306E
76
tPHL1
(Fig. 7)
TABLE III. Group A inspection for device type 04 - Continued
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup Symbol
Cases E,F
Cases 2, X
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
method
Test no.
CLK
AIN
BIN
CIN
VCC
DIN
EIN
Enable
Serial
QE
QD
GND
QC
QB
QA
CLR
(Fig. 7)
107
Measured Test Limits
terminal
Unit
Min
Max
17
---
MHz
108 to 112 Same tests and terminal conditions as for subgroup 9.
5
68
ns
tPLH2
113 to 122
"
60
"
tPHL1
123 to 127
"
68
"
tPHL2
128 to 132
"
90
"
10
fmax
Tc = 25°C See E
tPLH1
11
MIL-STD883
3003
(Fig, 7)
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55°C.
Notes:
B. VIN = 0.4 V.
77
C. Tests numbers 53 through 80 shall be run in sequence.
D. Output voltages shall be either: (1) H ≥2.5 V minimum and L ≤0.4 V maximum when using a high speed checker double
double comparator; (2) H ≥1.5 V and L ≤1.5 V when using a high speed checker single comparator.
E. fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency shall be one-half of the input
clock frequency. The input frequency on the serial data shall be one-half of the clock input frequency and the serial shall be
shifted such that the serial ↑ and ↓ are coincident with the clock ↓. Rise and fall times ≤ 6 ns. Input peak voltage 3 to 5 volts.
1/ IIL limits (mA) min/max values for circuits shown:
Parameter
IIL3
Terminal
A
B
CLK
-.16/-.40
-.16/-.40
AIN, BIN, CIN
-.16/-.40
-.12/-.36
Serial
-.10/-.34
-.10/-.34
Enable
-.8/-2.0
-.6/-1.8
DIN, EIN, CLR
IIL5
F. 3.0 V minimum/5.0 V maximum.
MIL-M-38510/306E
A. VIN = 2.5 V.
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
See footnotes at end of device type 05.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
AIN
2.0 V
"
"
"
"
"
"
"
3
BIN
2.0 V
"
"
"
"
"
"
"
4
QA
-.4 mA
5
QB
8
QC
9
QD
10
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
12
CLK
J 1/
" 2/
" 3/
" 4/
" 5/
" 6/
" 7/
" 8/
13
CLR
2.0 V
"
"
"
"
"
"
"
0.7 V
"
"
"
"
"
"
"
14
QE
16
QF
18
QG
19
QH
20
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
-.4 mA
-.4 mA
-.4 mA
4 mA
4 mA
4 mA
4 mA
-18 mA
-18 mA
2.7 V
GND
5.5 V
GND
0.4 V
4.5 V
GND
2.7 V
GND
5.5 V
4.5 V
0.4 V
-18 mA
-18 mA
2.7 V
2.7 V
5.5 V
5.5 V
0.4 V
0.4 V
-.4 mA
-.4 mA
-.4 mA
-.4 mA
4 mA
4 mA
4 mA
4 mA
Test
Measured
terminal
QA
QB
QC
QD
QE
QF
QG
QH
QA
QB
QC
QD
QE
QF
QG
QH
AIN
BIN
CLK
CLR
AIN
BIN
CLK
CLR
AIN
BIN
CLK
CLR
AIN
BIN
CLK
CLR
Limits
Min
Max
2.5
"
"
"
"
"
"
"
0.4
"
"
"
"
"
"
"
-1.5
"
"
"
20
"
"
"
100
"
"
"
10/
10/
"
"
"
"
"
"
Unit
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µΑ
"
"
"
"
"
"
"
mA
"
"
"
MIL-M-38510/306E
78
Cases
MIL-STD883
A,B,C,D
Subgroup Symbol method Cases 2,X
Test no.
1
VOH
3006
1
2
Tc = 25°C
3
4
5
6
7
8
VOL
3007
9
10
11
12
13
14
15
16
VIC
17
18
19
20
IIH1
3010
21
22
23
24
IIH2
25
26
27
28
IIL1
3009
29
30
31
32
TABLE III. Group A inspection for device type 05 - Continued
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
1
Tc = 25°C
Symbol
IOS
ICC
MIL-STD883
method
3011
3005
1
2
3
4
5
6
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Test no.
33 9/
34 "
35 "
36 "
37 "
38 "
39 "
40 "
AIN
4.5 V
"
"
"
"
"
"
"
BIN
4.5 V
"
"
"
"
"
"
"
QA
GND
QB
QC
QD
GND
"
"
"
"
"
"
"
"
CLK
A 1/
" 2/
" 3/
" 4/
" 5/
" 6/
" 7/
" 8/
CLR
4.5 V
"
"
"
"
"
"
"
QE
QF
QG
QH
VCC
5.5 V
"
"
"
"
"
"
"
QA
QB
QC
QD
QE
QF
QG
QH
41
GND
GND
"
5.5 V
J
"
VCC
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
B
C
"
"
"
B
C
B
C
B
C
B
C
B
C
B
C
B
C
B
C
C
B
C
B
C
C
B
C
B
C
C
B
C
B
C
B
C
B
C
C
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
GND
2
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted
7
TC = 25°C
Truth
table
test
3014
79
See footnotes at end of device type 05.
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
B
"
"
"
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
B
"
"
"
C
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
7
8
9
10
11
12
13
GND
GND
GND
GND
L
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
L
L
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
14
Measured
terminal
Test Limits
Unit
Min
-15
"
"
"
"
"
"
"
Max
-100
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
27
"
See B,C,D and E
MIL-M-38510/306E
Cases
A,B,C,D
Cases 2, X
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
8
Symbol
Cases
A,B,C,D
Cases 2, X
1
MIL-STD883
3
4
5
6
7
8
9
10
11
12
13
14
2
3
4
6
8
9
10
12
13
14
16
18
19
20
method
Test no.
AIN
BIN
QA
QB
QC
QD
GND
CLK
CLR
QE
QF
QG
QH
VCC
GND
IN
G
5.0 V
QA
22
"
"
"
"
"
"
"
CLK TO QA
CLK TO QB
5
"
32
"
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK TO QC
CLK TO QD
CLK TO QE
CLK TO QF
CLK TO QG
CLK TO QH
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QE
CLK TO QF
CLK TO QG
CLK TO QH
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QE
CLK TO QF
CLK TO QG
CLK TO QH
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
37
"
"
"
"
"
"
"
41
"
"
"
"
"
"
"
"
"
"
"
"
"
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Measured
terminal
Limits
Min
Unit
Max
Same tests, terminal conditions, and limits as subgroup 7 except TC = 125°C and -55°C.
9
fMAX
TC = 25°C See
note F
tPLH1
82
IN
G
OUT
3003
(Fig. 8)
83
84
IN
See
fig. 8
"
"
"
"
"
"
"
"
"
"
"
"
"
"
G
"
"
"
"
"
"
"
G
See
fig. 8
"
"
"
"
"
"
"
"
"
"
"
"
"
"
G
"
"
"
"
"
"
"
OUT
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
80
tPHL2
10
fMAX
TC = 125°C See F
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MHz
(Fig. 8)
107
20
tPLH1
3003
(Fig. 8)
108 to 115
5
48
ns
tPHL1
3003
(Fig. 8)
116 to 123
5
66
ns
tPHL2
3003
(Fig. 8)
124 to 131
5
62
ns
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55°C.
See footnotes at end of device type 05.
MHz
MIL-M-38510/306E
(Fig. 8)
tPHL1
11
2
FOOTNOTES:
A.
Apply input pulse:
2.5 V minimum/5.5 V maximum.
B.
VIN = 2.5 V.
C.
VIN = 0.4 V.
D.
Test numbers 42 through 81 shall be run in sequence.
E.
Output voltages shall be either: (1) H ≥2.5 V minimum and L ≤0.4 V maximum when using a high speed checker double comparator; (2) H ≥1.5 V and L ≤1.5 V when using a high speed checker single
comparator.
F.
fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency shall be one-half of the input clock frequency. The input frequency on the AIN data shall be one-half of the clock
input frequency and the AIN shall be shifted such that the AIN and are coincident with the clock. Rise and fall times ≤ 6 ns. Input peak voltage 3 to 5 volts.
G.
3.0 V minimum/5.0 V maximum.
J.
Apply input pulse:
1/
One pulse minimum.
2/
Two pulses minimum.
3/
Three pulses minimum.
4/
Four pulses minimum.
5/
Five pulses minimum.
6/
Six pulses minimum.
7/
Seven pulses minimum.
8/
Eight pulses minimum.
9/
At the manufacturer's option, IOS tests 33 through 40, the following alternate procedure may be used; apply 2.75 volts @; test 33, QA , test 34, QB, test 35, QC, test 36, QD, test 37, QE, test 38, QF, test 39,
QG, test 40, QH, and min/max limits of -7.5/-50 mA.
10/
IIL limits (mA) min/max values for circuits shown:
0V
IIL1
Terminal
MIL-M-38510/306E
81
Parameter
2.5 V minimum/5.5 V maximum
0V
A
B
C
D
E
AIN, BIN
0/-.34
-.10/-.34
-.16/-.40
-.16/-.40
-.135/-.370
CLK
0/-.4
-.16/-.4
-.12/-.36
-.20/-.44
"
CLR
0/-.4
-.16/-.4
-.12/-.36
-.16/-.40
"
F
-.12/-.36
G
-.16/-.40
"
"
"
"
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
See footnotes at end of device types 06.
7
8
9
10
11
12
10
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
12
CONT
4.5 V
"
"
"
"
"
"
"
"
"
13
CLK
A
"
"
"
"
"
"
"
"
"
14
QD
16
QC
18
QB
13
14
19
20
QA
VCC
-1.0 mA 4.5 V
-1.0 mA
"
-1.0 mA
"
-1.0 mA
"
-1.0 mA
"
12 mA
"
12 mA
"
12 mA
"
12 mA
"
12 mA
"
"
"
"
"
"
"
-18 mA
"
-18 mA
"
5.5 V
"
"
"
"
"
2.7 V
"
2.7 V
"
"
"
"
"
"
"
5.5 V
"
5.5 V
"
0.7 V
A
2.7 V
"
"
"
2.7 V
"
"
"
2.7 V
"
"
"
2.7 V
"
"
"
0.4 V
"
"
"
0.4 V
"
"
"
0.4 V
"
"
"
0.4 V
"
Limits
Measured
terminal
QA
QA
QB
QC
QD
QA
QA
QB
QC
QD
Serial
AIN
BIN
CIN
DIN
Mode
CONT
CLK
Serial
AIN
BIN
CIN
DIN
Mode
CONT
CLK
Serial
AIN
BIN
CIN
DIN
Mode
CONT
CLK
QA
QB
QC
QD
QA
QB
QC
QD
Unit
Min
2.4
"
"
"
"
Max
0.4
"
"
"
"
-1.5
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
20
"
"
"
-20
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µΑ
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
82
Cases
MIL-STD1
2
3
4
5
6
883
A,B,C,D
Subgroup Symbol method Cases 2,X
2
3
4
5
8
9
Test no. Serial
AIN
BIN
CIN
DIN
Mode
1
VOH
3006
1
2.0 V
0.7 V
2
2.0 V
2.0 V
Tc = 25°C
3
2.0 V
"
4
2.0 V
"
5
2.0 V
"
VOL
3007
6
0.7 V
0.7 V
7
0.7 V
2.0 V
8
0.7 V
"
9
0.7 V
"
10
0.7 V
"
VIC
11
-18 mA
12
-18 mA
13
-18 mA
14
-18 mA
15
-18 mA
16
-18 mA
17
18
IIH1
3010
19
2.7 V
4.5 V
20
2.7 V
GND
21
2.7 V
"
22
2.7 V
"
23
2.7 V
"
24
2.7 V
25
26
IIH2
27
5.5 V
4.5 V
28
5.5 V
GND
29
5.5 V
"
30
5.5 V
"
31
5.5 V
"
32
5.5 V
33
34
IOZH
35
0.7 V
4.5 V
36
0.7 V
"
37
0.7 V
"
38
0.7 V
"
IOZL
39
2.0 V
"
40
2.0 V
"
41
2.0 V
"
42
2.0 V
"
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup Symbol
1
IIL1
Tc = 25°C
I0S
method
3009
3011
3005
3005
Cases
A,B,C,D
Cases 2, X
Test no.
43
44
45
46
47
48
49
50
51
52
53
54
55
56
1
2
3
4
5
6
7
9
10
11
12
13
14
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Serial
0.4 V
AIN
BIN
CIN
DIN
Mode
GND
4.5 V
"
"
"
0.4 V
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CONT
CLK
QD
QC
QB
QA
VCC
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
0.4 V
0.4 V
0.4 V
0.4 V
4.5 V
4.5 V
4.5 V
5.5 V
5.5 V
GND
GND
GND
GND
GND
GND
4.5 V
GND
GND
4.5 V
"
"
"
5.5 V
5.5 V
2
Same tests, terminal conditions and limits as subgroup 1 except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1 except TC = -55°C and VIC tests are omitted.
83
See footnotes at end of device type 06.
8
0.4 V
4.5 V
"
"
"
5.5 V
GND
0.4 V
A
"
"
"
"
GND
GND
GND
GND
GND
Measured
terminal
Serial
AIN
BIN
CIN
DIN
Mode
CONT
CLK
QA
QB
QC
QD
VCC
VCC
Test Limits
Min
1/
"
"
"
"
"
"
"
2/
"
"
"
Max
1/
"
"
"
"
"
"
"
2/
"
"
"
27
29
Unit
mA
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
ICC
ICC
MIL-STD883
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
7
Truth
Tc = 25°C table
tests
MIL-STD883
method
3014
1
2
3
4
5
6
7
8
9
10
11
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Test no.
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
Serial
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
AIN
B
B
B
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
BIN
B
B
B
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
CIN
B
B
B
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
DIN
B
B
B
C
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
Mode
B
"
"
"
"
"
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CONT
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
B
C
B
B
C
B
B
C
B
C
B
C
B
C
B
B
C
B
C
B
C
B
C
QD
X
H
H
H
L
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
QC
X
H
H
H
L
"
L
"
"
"
"
H
"
QB
X
H
H
H
L
"
"
"
"
H
"
"
"
"
"
"
"
"
L
"
"
"
"
QA
X
H
H
H
L
L
L
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
VCC
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
G
IN
OUT
5.0 V
QA
20
G
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
"
"
"
"
"
"
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QA
CLK to QB
6
"
"
"
"
"
35
"
"
"
"
"
ns
"
"
"
'
"
"
"
"
"
"
CLK to QC
"
"
"
"
"
"
"
"
CLK to QD
"
"
"
G
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QA
CLK to QB
"
"
"
"
"
"
40
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK to QC
"
"
"
"
"
"
"
"
CLK to QD
"
"
"
"
"
"
"
"
"
L
L
L
12
13
14
Measured
terminal
Limits
Min
Unit
Max
See B,C,D, and E
Same tests, terminal conditions, and limits as subgroup 7 except TC = 125°C and -55°C.
9
fMAX
TC = 25°C See
note F
tPLH1
(Fig. 9)
80
3003
(Fig. 9)
81
82
83
84
85
86
87
88
tPHL1
89
90
91
92
93
94
95
96
See footnotes at end of device type 06.
IN
IN
IN
IN
IN
IN
See
fig. 9
See
fig. 9
See
fig. 9
IN
IN
IN
IN
IN
See
fig. 9
See
fig. 9
See
fig. 9
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
"
"
"
OUT
OUT
OUT
OUT
"
OUT
OUT
OUT
MHz
MIL-M-38510/306E
84
8
Cases
A,B,C,D
Cases 2, X
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
MIL-STDSymbol
883
9
tZL
TC = 25°C
method
(Fig. 9)
tZH
tLZ
tHZ
tPLH1
85
tPHL1
tZL
11
3003
(Fig. 9)
1
2
3
4
5
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Test no.
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
Serial
AIN
GND
BIN
CN
DIN
Mode
G
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CONT
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
QD
QC
QB
QA
OUT
VCC
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
GND
G
G
G
G
GND
GND
GND
GND
G
G
G
G
6
7
8
9
10
11
12
13
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
14
Measured
terminal
CONT to QA
CONT TO QB
CONT TO QC
CONT TO QD
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
CLK TO QA
CLK TO QB
CLK TO QC
CLK TO QD
Limits
Min
5
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Max
35
"
"
"
30
"
"
"
55
"
"
"
65
"
"
"
Unit
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
113
18
114 to 121
5
46
ns
"
52
"
"
45
"
122 to 129
130 to 133
Same test and terminal conditions as subgroup 9.
MHz
tZH
134 to 137
"
39
"
tLZ
138 to 141
"
71
"
tHZ
142 to 145
"
84
"
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C.
See footnotes at end of device type 06.
MIL-M-38510/306E
10
fMAX
TC =125°C See F
Cases
A,B,C,D
Cases 2, X
FOOTNOTES:
A. Apply input pulse:
2.5 V minimum/5.5 V maximum
0V
B. VIN = 2.4 V.
C. VIN = 0.4 V.
D. Test numbers 57 through 79 shall be run in sequence.
E. Output voltages shall be either: (1) H ≥2.5 V minimum and L ≤0.4 V maximum when using a high speed checker double comparator; (2) H ≥1.5 V and L <1.5 V when using a high
speed checker single comparator.
F. fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency shall be one-half of the input clock frequency. The input frequency on the serial shall be
one-half of the clock input frequency and the serial shall be shifted such that the serial ↑ and ↓ are coincident with the clock ↑ . Rise and fall times ≤ 6 ns. Input peak voltage 3 to 5
volts.
1/ IIL limits (mA) min/max values for circuits shown:
86
Parameter
IIL1
Terminal
Serial
AIN, BIN,
CIN, DIN
Mode
CONT
CLK
A
-.075/-.250
-.12/-.36
B
-.16/-.40
-.16/-.40
C
-.16/-.40
-.16/-.40
D
-.105/-.345
-.105/-.345
E
-.12/-.36
-.12/-.36
-.16/-.40
-.16/-.40
-.16/-.40
-.15/-.38
-.16/-.40
-.20/-.44
-.03/-.3
-.03/-.3
-.03/-.3
-.12/-.36
-.12/-.36
-.12/-.36
-.12/-.36
-.12/-.36
-.12/-.36
2/ IOS limits (mA) min/max values for circuit A: -30/-130.
for circuits B, C, D, E: -15/-100.
MIL-M-38510/306E
G. 3.0 V minimum/5.0 V maximum.
TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup Symbol
1
VOH
Tc = 25°C
VOL
VIC
87
IIH2
IOZH
IOZL
See footnotes at end of device types 07.
8
10
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
'
"
"
"
"
"
"
"
"
"
"
9
12
CONT
0.7 V
"
"
"
"
"
"
"
"
"
10
13
CLK
A
"
"
"
"
"
"
"
"
"
11
14
QD'
12
15
QD
13
17
QC
-.1 mA
-.1 mA
-.4 mA
12 mA
12 mA
4 mA
-18 mA
-18 mA
2.7 V
2.7 V
5.5 V
2.0 V
"
"
"
"
"
"
"
5.5 V
A
"
"
"
"
"
"
"
2.7 V
2.7 V
0.4 V
0.4 V
14
18
QB
15
16
19
20 Measured
QA
VCC
terminal
-.1 mA 4.5 V
QA
-.1 mA
"
QB
"
QC
"
QD
"
QD'
12 mA
"
QA
12 mA
"
QB
"
QC
"
QD
"
QD'
"
CLR
"
Serial
"
AIN
"
BIN
"
CIN
"
DIN
"
Load
"
CONT
"
CLK
5.5 V
CLR
"
Serial
"
AIN
"
BIN
"
CIN
"
DIN
"
Load
"
CONT
"
CLK
"
CLR
"
Serial
"
AIN
"
BIN
"
CIN
"
DIN
"
Load
"
CONT
"
CLK
2.7 V
"
QA
2.7 V
"
QB
"
QC
"
QD
0.4 V
"
QA
0.4 V
"
QB
"
QC
"
QD
Test Limits
Unit
Min
2.4
"
"
"
2.5
Max
0.4
"
"
"
"
-1.5
"
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
20
"
"
"
-20
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µΑ
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
IIH1
1
2
3
4
5
6
7
MIL-STD- Cases E,F
883
Cases 2,X
2
3
4
5
7
8
9
method
Test no.
CLR
Serial
AIN
BIN
CIN
DIN
Load
3006
1
2.0 V
2.0 V 2.0 V 2.0 V 2.0 V 2.0 V
2
"
"
"
"
"
"
3
"
"
"
"
"
"
4
"
"
"
"
"
"
5
"
"
"
"
"
"
3007
6
"
0.7 V 0.7 V 0.7 V 0.7 V
"
7
"
"
"
"
"
"
8
"
"
"
"
"
"
9
"
"
"
"
"
"
10
"
"
"
"
"
"
11
-18 mA
12
-18 mA
13
-18 mA
14
-18 mA
15
-18 mA
16
-18 mA
17
-18 mA
18
19
3010
20
2.7 V
21
2.7 V
4.5 V
22
2.7 V
GND
23
2.7 V
"
24
2.7 V
"
25
2.7 V
"
26
2.7 V
27
GND
28
GND
29
5.5 V
30
5.5 V
4.5 V
31
5.5 V
GND
32
5.5 V
"
33
5.5 V
"
34
5.5 V
"
35
5.5 V
36
GND
37
GND
38
2.0 V
0.7 V 0.7 V 0.7 V 0.7 V 2.0 V
39
"
"
"
"
"
"
40
"
"
"
"
"
"
41
"
"
"
"
"
"
42
"
2.0 V 2.0 V 2.0 V 2.0 V
"
43
"
"
"
"
"
"
44
"
"
"
"
"
"
45
"
"
"
"
"
"
TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0; or low ≤ 0.7 V; or open).
Subgroup
Symbol
1
IIL1
Tc = 25°C
IOS
ICC
ICC
MIL-STD- Cases E,F
883
Cases 2,X
method
Test no.
3009
46
47
48
49
50
51
52
53
54
3011
55
56
57
58
59
3005
60
3005
61
1
2
CLR
0.4 V
B
2
3
Serial
3
4
AIN
4
5
BIN
5
7
CIN
6
8
DIN
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
4.5 V
"
"
"
"
5.5 V
GND
GND
"
"
"
"
5.5 V
5.5 V
4.5 V
"
"
"
"
GND
GND
4.5 V
"
"
"
"
GND
GND
4.5 V
"
"
"
"
GND
GND
4.5 V
"
"
"
"
GND
GND
7
9
Load
GND
4.5 V
"
"
"
0.4 V
4.5 V
"
"
"
"
"
"
5.5 V
5.5 V
8
10
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
88
7
Truth
TC = 25° C table
test
3014
62
63
64
65
66
67
See footnotes at end of device types 07.
D
D
D
C
C
C
C
D
C
"
"
"
C
D
C
"
"
"
C
D
C
"
"
"
C
D
C
"
"
"
C
D
C
"
"
"
C
D
C
"
"
"
GND
"
"
"
"
"
10
13
CLK
11
14
QD'
12
15
QD
13
17
QC
14
18
QB
15
19
QA
A
0.4 V
0.4 V
GND
"
"
"
"
5.5 V
GND
A
"
"
"
"
"
GND
D
"
"
"
"
"
C
D
C
C
D
C
GND
GND
GND
GND
GND
L
"
"
"
H
H
L
"
"
"
H
H
L
"
"
"
H
H
L
"
"
"
H
H
L
"
"
"
H
H
16
20
VCC
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Measured
terminal
CLR
Serial
AIN
BIN
CIN
DIN
Load
CONT
CLK
QA
QB
QC
QD
QD'
VCC
VCC
Test Limits
5.0v
"
"
"
"
"
All
outputs
"
"
"
"
Unit
Min
1/
"
"
"
"
"
"
"
"
2/
"
"
"
"
Max
1/
"
"
"
"
"
"
"
"
2/
"
"
"
"
34
31
mA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
See C,D,E, and F
MIL-M-38510/306E
2
9
12
CONT
TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
7
Truth
Tc = 25°C table
tests
Cases E, F
Cases 2, X
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
Measured
terminal
method
3014
Test no.
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
CLK
C
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Serial
C
"
"
"
"
"
"
"
"
"
"
"
D
"
"
"
"
"
"
"
AIN
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
BIN
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
CIN
D
"
"
"
"
"
"
"
"
"
"
"
C
"
"
"
"
"
"
"
DIN
D
"
"
"
"
"
C
"
"
"
"
"
C
"
"
"
"
"
"
"
Load
C
C
C
D
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CONT
D
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
C
D
C
C
D
C
D
C
D
C
D
C
C
D
C
D
C
D
C
D
QD'
H
L
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
QD
H
L
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
QC
H
L
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
L
L
L
QB
H
L
"
"
"
"
H
"
"
"
"
"
"
"
"
L
"
"
"
"
QA
H
L
L
L
H
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
VCC
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
All
outputs
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
GND
IN
J
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
J
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Limits
Min
Unit
Max
See C,D,E, and F
Same tests, terminal conditions, as subgroup 7 except TC = 125°C and -55°C.
9
fMAX
TC = 25°C See G
tPLH1
tPHL1
(Fig. 10)
88
J
3003
(Fig. 10)
89
90
91
92
93
94
95
"
"
"
"
"
"
"
96
97
98
99
100
101
102
103
104
105
"
"
"
"
"
"
"
"
"
"
106
107
108
"
"
"
See footnotes at end of device type 07.
IN
IN
IN
IN
IN
IN
IN
See
fig. 10
"
"
"
IN
IN
IN
IN
IN
IN
See
(fig. 10)
"
"
"
"
"
"
OUT 5.0 V
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
QA
22
"
"
"
"
"
"
"
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QD'
CLK to QA
CLK to QB
5
"
"
"
"
"
"
37
"
"
"
"
"
"
ns
"
"
"
'
"
"
"
"
"
"
"
"
"
"
"
CLK to QC
CLK to QD
CLK to QD'
CLK to QA
CLK to QB
CLK to QC
CLK to QD
CLK to QD'
CLK to QA
CLK to QB
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK to QC
CLK to QD
CLK to QD'
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MHz
MIL-M-38510/306E
89
8
MIL-STD883
TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
9
TC = 25°C
tPHL2
Cases E, F
Cases 2, X
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
14
20
Measured
terminal
method
3003
(Fig. 10)
Test no.
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
CLK
IN
"
"
"
"
"
"
"
"
J
"
"
"
GND
"
"
"
J
"
"
"
Serial
AIN
J
BN
CIN
DIN
Load
J
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CONT
GND
"
"
"
"
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
IN
"
"
"
"
QD'
QD
QC
QB
QA
OUT
VCC
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLR to QA
CLR to QB
CLR to QC
CLR to QD
CLR to QD'
CONT to QA
CONT TO QB
CONT TO QC
CONT TO QD
CONT TO QA
CONT TO QB
CONT TO QC
CONT TO QD
CONT TO QA
CONT TO QB
CONT TO QC
CONT TO QD
CONT TO QA
CONT TO QB
CONT TO QC
CONT TO QD
tZL
tZH
tLZ
tHZ
90
10
fMAX
TC = 125°C See G
J
J
J
J
J
J
J
J
J
J
J
J
"
"
"
J
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
IN
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
IN
"
"
"
OUT
OUT
OUT
OUT
Min
5
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Max
37
"
"
"
"
35
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Unit
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
(Fig. 10)
130
20
3003
(Fig. 10)
131 to 140
5
56
ns
tPHL1
141 to 150
"
56
"
tPHL2
151 to 155 Same tests and terminal conditions as for subgroup 9.
"
56
"
tZL
156 to 159
"
53
"
tZH
160 to 163
"
"
"
tLZ
164 to 167
"
"
"
168 to 171
"
"
"
tPLH1
tHZ
11
J
Limits
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55°C
See footnotes at end of device type 07.
MHz
MIL-M-38510/306E
MIL-STD883
FOOTNOTES:
2.5 V minimum/5.5 V maximum
0 V-
A. Apply input pulse:
B. Apply input pulse:
2.5 V minimum/5.5 V maximum.
0V
C. VIN = 2.4V.
D. VIN = 0.4 V.
E. Test numbers 62 through 87 shall be run in sequence.
F. Output voltages shall be either: (1) H ≥2.5 V minimum and L ≤0.4 V maximum when using a high speed checker double comparator: (2) H ≥1.5 V and L <1.5 V when using a high
speed checker single comparator.
G. fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency shall be one-half of the input clock frequency. The input frequency on the parallel input
shall be one-half of the clock input frequency and the parallel input shall be shifted such that the parallel input ↑ and ↓ are coincident with the clock ↑ . Rise and fall times ≤ 6 ns.
Input peak voltage 3 to 5 volts.
1/ IIL limits (mA) min/max values for circuits shown:
91
Parameter
Terminal
A
B
C
D
IIL1
Serial
AIN, BIN, CIN
DIN
CLR, Load,
CONT, CLK
-.075/-.250
-.12/-.36
-.16/-.40
-.16/-.40
-.16/-.40
"
"
-.03/-.30
-.105/-.345
-.105/-.345
-.16/-.40
-.12/-.36
-.12/-.36
-.12/-.36
-.105/-.345
-.12/-.36
2/ IOS limits for circuit A for QA through QD are -30 to -130 mA, for QD' is -20 to -100 mA, and for circuits B, C, and D
are -15 to -100 mA.
MIL-M-38510/306E
J. 3.0 V minimum/5.0 V maximum.
TABLE III. Group A inspection for device type 08
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
1
VOH
Tc = 25°C
3006
3006
1
2
1
2
Shift
Load
0.7 V
"
VOL
3007
3007
3
4
"
"
5
6
7
8
9
10
11
12
13
14
15
16
-18 mA
Subgroup
Symbol
MIL-STD- Cases E,F
883
Cases 2,X
method
Test no.
VIC
IIL6
3009
4
5
F
5
7
G
6
8
H
-.4 mA
0.7 V
2.0 V
"
"
4 mA
4 mA
-18 mA
-18 mA
0.4 V
92
See footnotes at end of device types 08.
9
12
QH
GND
"
-18 mA
GND
QH
8
10
GND
-.4 mA
-18 mA
GND
"
"
"
7
9
2.0 V
0.7 V
-18 mA
17
18
19
20
21
22
23
24
25
26
3
4
E
0.4 V
0.4 V
0.4 V
0.4 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
10
13
Serial
INP
11
14
A
12
15
B
13
17
C
14
18
D
15
19
CLK
INHB
16
20
VCC
4.5 V
"
"
"
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
Test Limits
Measured
terminal
QH
QH
QH
Unit
Min
Max
2.5
2.5
V
"
0.4
0.4
"
"
-1.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
QH
S/L
CLK
E
F
G
H
S/INP
A
B
C
D
CLK/INHB
5.5 V
CLK
1/
1/
mA
"
"
"
"
"
"
"
"
"
E
F
G
H
S/INP
A
B
C
D
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
IIL1
2
3
CLK
TABLE III. Group A inspection for device type 08 - Continued
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup Symbol
1
IIL1
MIL-STD- Cases E,F
883
Cases 2, X
method
Test no.
3009
27
Tc = 25°C IIL7
IIH1
28
3010
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
Shift
Load
CLK
E
F
G
H
QH
GND
QH
Serial
INP
A
B
C
D
CLK
INHB
VCC
0.4 V
5.5 V
GND
0.4 V
29
30
31
32
33
34
35
36
37
38
39
IIH2
41
42
43
44
45
46
47
48
49
50
51
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
5.5 V
5.5 V
5.5 V
52
5.5 V
IOS
IOS
3011
3011
53
54
GND
"
ICC
ICC
3005
3005
55
56
"
"
4.5 V
4.5 V
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
GND
1/
1/
mA
1/
mA
20
"
"
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
E
F
G
H
S/INP
A
B
C
D
CLK/INHB
S/L
60
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
E
F
G
H
S/INP
A
B
C
D
CLK/INHB
0.1
"
"
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
"
"
"
"
QH
"
"
"
"
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnotes at end of device type 08.
Max
"
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
5.5 V
GND
Min
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
CLK/INHB
Unit
"
"
5.5 V
Measured Test Limits
terminal
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
4.5 V
"
"
1/
S/L
QH
VCC
VCC
-15
-15
0.3
"
-100
-100
"
"
36
36
"
"
MIL-M-38510/306E
40
93
IIH11
IIH12
1
2
TABLE III. Group A inspection for device type 08 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
7 2/
Tc = 25°C
9
TC = 25°C
Truth
table
tests
MIL-STD- Cases E, F
883
Cases 2, X
method
Test no.
3014
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
Shift
Load
B
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
CLK
E
F
G
H
QH
GND
QH
A
B
C
D
B
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
H
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
H
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
L
L
L
Serial
INP
A
A
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
OUT
IN
OUT
15
19
16
20
Measured
terminal
CLK VCC
INHB
B
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
A
"
Limits
Min
Unit
Max
3/
Same tests, terminal conditions, as subgroup 7 except TC = 125°C and -55°C.
fMAX 4/
tPLH5
tPHL5
tPLH5
3003
See
fig. 11
78
5.0 v
IN
79
80
IN
"
IN
"
OUT
"
"
OUT
"
81
"
"
tPHL5
82
"
"
tPLH1
tPHL1
83
84
5.0 V
"
IN
"
tPLH1
85
"
"
tPHL1
86
"
"
tPLH3
87
GND
tPHL3
tPLH4
88
89
"
"
tPHL4
90
"
See footnotes at end of device type 08.
"
OUT
OUT
OUT
"
"
OUT
"
"
OUT
IN
"
OUT
"
"
OUT
OUT
"
"
"
OUT
"
GND 5.0 V
25
S/L to QH
MHz
"
"
S/L to Q H
5
"
40
"
ns
"
"
S/L to Q H
"
"
"
S/L to Q H
CLK to QH
"
"
"
CLK to Q H
"
"
45
"
'
"
CLK to Q H
"
"
"
CLK to Q H
H to QH
"
"
"
"
30
"
35
35
"
"
30
"
"
GND
"
CLK to QH
"
"
"
"
"
"
H to QH
"
H to Q H
"
"
"
H to Q H
"
MIL-M-38510/306E
94
8
Symbol
TABLE III. Group A inspection for device type 08 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
MIL-STD883
Cases E, F
Cases 2, X
1
2
2
3
3
4
4
5
5
7
6
8
7
9
8
10
9
12
10
13
11
14
12
15
13
17
14
18
15
19
16
20
method
Test no.
Shift
Load
CLK
E
F
G
H
QH
GND
QH
Serial
INP
A
B
C
D
CLK
INHB
VCC
10
fMAX
TC = 125°C
tPLH5
tPHL5
tPLH5
tPHL5
tPLH1
tPHL1
tPLH1
tPHL1
tPLH3
tPHL3
tPLH4
tPHL4
3003
See
fig. 11
Measured
terminal
Limits
Min
91
20
92
93
94
95
96
97
98
99
100
101
102
103
5
"
"
"
"
"
"
"
"
"
"
"
Same tests and terminal conditions as subgroup 9, except TC = 125°C.
Unit
Max
MHz
52
"
"
"
58
"
"
"
39
46
46
39
ns
"
"
"
'
"
"
"
"
"
"
"
11
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55°C.
TC = -55°C
95
2/ A = 2.5 V and B = 0.4 V.
3/ Output voltages shall be either:
(a) H = 2.5 V minimum and L = 0.4 V maximum when using a high speed checker double comparator or,
(b) H ≥1.5 V and L ≤1.5 V when using a high speed checker single comparator.
4/ fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency
shall be one-half of the input clock frequency. The input frequency on the serial shall be one-half
of the clock input frequency and the serial shall be shifted such that the serial ↑ and ↓ are coincident
with the clock ↓ , but may be offset sufficiently to assure adequate tSETUP and tHOLD. Rise and fall times ≤
6 ns. Input peak voltage 3 to 5 volts.
1/ IIL limits (mA) min/max values for circuit shown:
Parameter
IIL1
IIL6
IIL7
Terminal
A
C
F
CLK, CLK/INHIB
A,B,C,D,
E,F,G,H
S/IN
S/L
-.001/-.150
-.120/-.360
-.12/-.38
-.12/-.38
-.005/-.72
-.12/-.38
-.100/-.340
-.001/-.150
-.12/-.38
-.36/-1.08
-.12/-.38
-.005/-.72
MIL-M-38510/306E
NOTES:
TABLE III. Group A inspection for device type 09- Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
MIL-STD- Cases E,F
883
Cases 2,X
method
Test no.
1
VOH
Tc = 25°C
3006
VOL
3007
VIC
3009
96
IIL1
IIL1
IIL1
IIL6
3
4
B
4
5
C
5
7
D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
6
8
CLK
INHB
7
9
CLK
8
10
GND
0.7 V
1/
0.7 V
1/
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
-18 mA
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
28
IIL7
IIH1
2
3
A
3010
29
30
31
32
33
34
35
36
37
38
39
40
41
See footnotes at end of device types 09
13
17
QH
14
18
H
15
19
Shift
load
16
20
VCC
Measured
terminal
Min
GND
-.4 mA
2.0 V
0.7 V
4.5 V
QH
2.5
"
4 mA
0.7 V
0.7 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
9
12
CLR
10
13
E
11
14
F
12
15
G
-18 mA
-18 mA
-18 mA
-18 mA
0.4 V
0.4 V
0.4 V
0.4 V
"
"
"
"
"
"
"
"
"
"
"
-18 mA
"
-18 mA
"
5.5 V
GND
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
0.4 V
"
"
"
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
"
"
"
"
"
"
"
"
"
"
"
"
"
Test Limits
QH
0.4
"
-.100
"
"
"
"
-.001
-.001
-.001
-.100
"
"
"
-1.5
"
"
"
"
"
"
"
"
"
"
"
"
-.340
"
"
"
"
-.150
-.150
-.150
-.340
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
"
"
"
-.001
-.150
"
20
"
"
"
"
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
Shift load
2.7 V
"
"
"
"
"
"
"
"
"
"
"
"
"
S/IN
A
B
C
D
CLK INHB
CLK
CLR
E
F
G
H
Shift load
2.7 V
2.7 V
2.7 V
2.7 V
V
S/IN
A
B
C
D
CLK INHB
CLK
CLR
E
F
G
H
Shift load
S/IN
A
B
C
D
CLK INHB
CLK
CLR
E
F
G
H
0.4 V
2.7 V
Unit
Max
MIL-M-38510/306E
IIL6
1
2
Ser. in
TABLE III. Group A inspection for device type 09- Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
Subgroup
Symbol
1
IIH2
Tc = 25°C
MIL-STD883
method
Cases E,F
Cases 2,X
Test no.
1
2
Ser. in
3010
42
43
44
45
46
47
48
49
50
51
52
53
54
5.5 V
3011
55
ICC
3005
56
3
4
B
4
5
C
5
7
D
6
8
CLK
INHB
7
9
CLK
8
10
GND
5.5 V
GND
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
4.5
GND
GND
GND
GND
GND
1/
"
GND
1/
"
97
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = 125° C and VIC tests are omitted.
3
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55° C and VIC tests are omitted.
7 2/
Truth
Tc = 25°C table
test
8
3014
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
A
B
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
Same tests, terminal conditions, and limits as subgroup 7, except TC = 125° C and -55°C.
See footnotes at end of device types 09.
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
9
12
CLR
10
13
E
11
14
F
12
15
G
13
17
QH
14
18
H
15
19
Shift
load
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
GND
GND
GND
GND
GND
B
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
L
H
"
"
"
L
L
H
H
L
L
H
H
L
L
H
H
H
16
20
VCC
Test Limits
Measured
terminal
Unit
Min
5.5 V
S/IN
"
A
"
B
"
C
"
D
"
CLK INHB
"
CLK
"
CLR
"
E
"
F
"
G
"
H
"
Shift load
5.5 V
GND
"
QH
GND
GND
"
VCC
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
B
B
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
-15
3/
Max
0.1
"
"
"
"
"
"
"
"
"
"
"
"
mA
-100
"
38
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/306E
IOS
2
3
A
TABLE III. Group A inspection for device type 09- Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; or low ≤ 0.7 V; or open).
MIL-STD883
method
Cases E,F
Cases 2,X
Test no.
9 4/
fMAX
Tc = 25°C
3003
76
tPHL5
See
fig. 12
77
Subgroup
Symbol
tPLH1
tPHL1
10
1
2
Ser. in
2
3
A
3
4
B
4
5
C
5
7
D
78
79
6
8
CLK
INHB
7
9
CLK
8
10
GND
9
12
CLR
GND
IN
GND
GND
GND
IN
IN
13
17
QH
14
18
H
15
19
Shift
load
16
20
VCC
Measured
terminal
Min
5.0 V
OUT
IN
GND
5.0 V
CLK to QH
25
"
"
IN
"
"
"
"
CLR to QH
5
"
40
ns
"
"
5.0 V
5.0 V
"
"
"
"
CLR to QH
CLR to QH
"
"
31
35
ns
fMAX
11
14
F
12
15
G
IN
IN
GND
GND
Test Limits
Unit
Max
MHz
20
Same tests and terminal as subgroup 9, except TC = 125°C.
tPHL5
tPLH1
tPHL1
11
10
13
E
ns
MHz
5
52
ns
5
5
40
46
ns
ns
Same tests, terminal conditions, and limits as subgroup 10, except TC = -55°C.
NOTES:
2.5 V minimum, 5.5 V maximum to clock input prior to test.
0V
2/ A = 2.5 V and B = 0.4 V.
3/ Output voltages shall be either:
a. H = 2.5 V minimum and L = 0.4 V maximum when using a high speed checker double comparator or,
b. H ≥1.5 V and L ≤1.5 V when using a high speed checker single comparator.
4/ fMAX minimum limit specified is the frequency of the clock input pulse. The output frequency
shall be one-half of the input clock frequency. The input frequency on the "H" shall be one-half
of the clock input frequency and the "H" shall be shifted such that the "H" ↑ and ↓ are coincident
with the clock ↓ . Rise and fall times ≤6 ns. Input peak voltage 3 to 5 volts.
MIL-M-38510/306E
98
1/ Apply
MIL-M-38510/306E
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these
personnel need to contact the responsible packaging activity to ascertain requisite packaging requirements.
Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military
Department of Defense Agency, or within the Military Department's system Command. Packaging data retrieval is
available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM
products, or by contacting the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature which may be helpful, but is not
mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
Complete part number (see 1.2).
c.
Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to contracting activity in addition to
notification to the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883),
corrective action, and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
j.
Requirements for "JAN" marking.
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
99
MIL-M-38510/306E
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ...........................................
IIN ................................................
VIC ...............................................
VIN ...............................................
Ground zero voltage potential
Current flowing into an input terminal
Input clamp voltage
Voltage level at an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
100
MIL-M-38510/306E
Military
device
type
01, circuit-02, circuit-03, circuit-04, circuit-05, circuit-06, circuit-07, circuit-08, circuit-09, circuit--
Company
Texas
Instruments
Signetics
Corp.
Raytheon
Company
A
A
A
A
A
A
A
A
A
B
B
B
B
B
C
B
-----
C
C
C
--G
B
-------
Advanced
Micro
Devices
D
D
----C
---------
Fairchild
Semiconductor
E
E
D
---E
D
C
C
---
Motorola,
Inc.
F
F
E
--F
E
D
F
F
National
Semiconductor
G
G
----D
---------
Generic
Industry
type
54LS194A
54LS195A
54LS95B
54LS96
54LS164
54LS295B
54LS395A
54LS165A
54LS166
6.6 Change from previous issue. Asterisks are not used in this revision to identify changes with respect to the
previous issue, due to the extensiveness of the changes.
Custodians:
Army - CR
Navy - EC
Air Force - 11
DLA - CC
Preparing activity:
DLA - CC
(Project 5962-1960)
Review activities:
Army – SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
101
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