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Jameco Part Number 876539
ree
Lead-Fage
P a c k ns
Optio le!
b
Availa
Features
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— 3.5 ns Maximum Propagation Delay
— Fmax = 250 MHz
— 3.0 ns Maximum from Clock Input to Data Output
— UltraMOS® Advanced CMOS Technology
GAL16V8
High Performance E2CMOS PLD
Generic Array Logic™
Functional Block Diagram
I/CLK
CLK
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
I
• E2 CELL TECHNOLOGY
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Yields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
PROGRAMMABLE
AND-ARRAY
(64 X 32)
• ACTIVE PULL-UPS ON ALL PINS
I
I
• EIGHT OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
— Programmable Output Polarity
— Also Emulates 20-pin PAL® Devices with Full
Function/Fuse Map/Parametric Compatibility
I
I
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS
— 100% Functional Testability
• APPLICATIONS INCLUDE:
— DMA Control
— State Machine Control
— High Speed Graphics Processing
— Standard Logic Speed Upgrade
• LEAD-FREE PACKAGE OPTIONS
OLMC
I
• 50% to 75% REDUCTION IN POWER FROM BIPOLAR
— 75mA Typ Icc on Low Power Device
— 45mA Typ Icc on Quarter Power Device
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
8
I
I
OE
I/OE
Pin Configuration
PLCC
Description
I
The GAL16V8, at 3.5 ns maximum propagation delay time, combines a high performance CMOS process with Electrically Erasable (E2) floating gate technology to provide the highest speed
performance available in the PLD market. High speed erase times
(<100ms) allow the devices to be reprogrammed quickly and efficiently.
I
I/CLK Vcc
2
20
I/O/Q
18
4
I
I
I
I/O/Q
GAL16V8
16
6
Top View
I
The generic architecture provides maximum design flexibility by
allowing the Output Logic Macrocell (OLMC) to be configured by
the user. An important subset of the many architecture configurations possible with the GAL16V8 are the PAL architectures listed
in the table of the macrocell description section. GAL16V8 devices
are capable of emulating any of these PAL architectures with full
function/fuse map/parametric compatibility.
8
14
9
I
GND
11
13
I/OE I/O/Q
I/O/Q
SOIC
I/CLK
1
I/O/Q
I/O/Q
5
I
I
I
GND
GAL
16V8
Top
View
1
I/O/Q
I/O/Q
15
20
I/O/Q
I
I
I/O/Q
GAL
16V8
I
I
Vcc
I/O/Q
I/O/Q
5
15
I/O/Q
Vcc
I
I
I
I/O/Q
I/CLK
I
20
I
I
Unique test circuitry and reprogrammable cells allow complete AC,
DC, and functional testing during manufacture. As a result, Lattice
Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and
data retention in excess of 20 years are specified.
I/O/Q
I/O/Q
I
DIP
I/O/Q
I
I/O/Q
I
I/O/Q
I
I/O/Q
I/O/Q
I/O/Q
GND
10
11
I/OE
I/O/Q
I/O/Q
10
11
I/OE
Copyright © 2005 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
16v8_10
1
September 2005
Specifications GAL16V8
GAL16V8 Ordering Information
Conventional Packaging
Commercial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
Icc (mA)
3.5
2.5
3.0
115
GAL16V8D-3LJ
20-Lead PLCC
5
3
4
115
GAL16V8D-5LJ
20-Lead PLCC
7.5
7
5
10
15
25
10
12
15
7
10
12
Ordering #
Package
115
GAL16V8D-7LP
20-Pin Plastic DIP
115
GAL16V8D-7LJ
20-Lead PLCC
115
GAL16V8D-7LS
20-Pin SOIC
55
GAL16V8D-10QP
20-Pin Plastic DIP
55
GAL16V8D-10QJ
20-Lead PLCC
115
GAL16V8D-10LP
20-Pin Plastic DIP
115
GAL16V8D-10LJ
20-Lead PLCC
115
GAL16V8D-10LS
20-Pin SOIC
55
GAL16V8D-15QP
20-Pin Plastic DIP
55
GAL16V8D-15QJ
20-Lead PLCC
90
GAL16V8D-15LP
20-Pin Plastic DIP
90
GAL16V8D-15LJ
20-Lead PLCC
90
GAL16V8D-15LS
20-Pin SOIC
55
GAL16V8D-25QP
20-Pin Plastic DIP
55
GAL16V8D-25QJ
20-Lead PLCC
90
GAL16V8D-25LP
20-Pin Plastic DIP
90
GAL16V8D-25LJ
20-Lead PLCC
90
GAL16V8D-25LS
20-Pin SOIC
Industrial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
7.5
7
5
10
10
7
15
12
10
20
13
11
25
15
12
Icc (mA)
Ordering #
Package
130
GAL16V8D-7LPI
20-Pin Plastic DIP
130
GAL16V8D-7LJI
20-Lead PLCC
130
GAL16V8D-10LPI
20-Pin Plastic DIP
130
GAL16V8D-10LJI
20-Lead PLCC
130
GAL16V8D-15LPI
20-Pin Plastic DIP
130
GAL16V8D-15LJI
20-Lead PLCC
65
GAL16V8D-20QPI
20-Pin Plastic DIP
65
GAL16V8D-20QJI
20-Lead PLCC
65
GAL16V8D-25QPI
20-Pin Plastic DIP
65
GAL16V8D-25QJI
20-Lead PLCC
130
GAL16V8D-25LPI
20-Pin Plastic DIP
130
GAL16V8D-25LJI
20-Lead PLCC
2
Specifications GAL16V8
Lead-Free Packaging
Commercial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
Icc (mA)
3.5
2.5
3.0
115
GAL16V8D-3LJN
115
GAL16V8D-5LJN
Lead-Free 20-Lead PLCC
115
GAL16V8D-7LPN
Lead-Free 20-Pin Plastic DIP
115
GAL16V8D-7LJN
Lead-Free 20-Lead PLCC
5
3
4
7.5
7
5
10
15
25
10
7
12
10
15
12
Ordering #
Package
Lead-Free 20-Lead PLCC
55
GAL16V8D-10QPN
Lead-Free 20-Pin Plastic DIP
55
GAL16V8D-10QJN
Lead-Free 20-Lead PLCC
115
GAL16V8D-10LPN
Lead-Free 20-Pin Plastic DIP
115
GAL16V8D-10LJN
Lead-Free 20-Lead PLCC
55
GAL16V8D-15QPN
Lead-Free 20-Pin Plastic DIP
55
GAL16V8D-15QJN
Lead-Free 20-Lead PLCC
90
GAL16V8D-15LPN
Lead-Free 20-Pin Plastic DIP
90
GAL16V8D-15LJN
Lead-Free 20-Lead PLCC
55
GAL16V8D-25QPN
Lead-Free 20-Pin Plastic DIP
55
GAL16V8D-25QJN
Lead-Free 20-Lead PLCC
90
GAL16V8D-25LPN
Lead-Free 20-Pin Plastic DIP
90
GAL16V8D-25LJN
Lead-Free 20-Lead PLCC
Industrial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
Icc (mA)
Ordering #
Package
7.5
7
5
130
GAL16V8D-7LJNI
Lead-Free 20-Lead PLCC
10
10
7
130
GAL16V8D-10LJNI
Lead-Free 20-Lead PLCC
130
GAL16V8D-15LJNI
Lead-Free 20-Lead PLCC
15
12
10
20
13
11
65
GAL16V8D-20QJNI
Lead-Free 20-Lead PLCC
25
15
12
65
GAL16V8D-25QJNI
Lead-Free 20-Lead PLCC
130
GAL16V8D-25LJNI
Lead-Free 20-Lead PLCC
Part Number Description
XXXXXXXX _ XX
X XX X
GAL16V8D Device Name
Grade
Speed (ns)
L = Low Power
Q = Quarter Power
Power
Blank = Commercial
I = Industrial
Package P = Plastic DIP
PN = Lead-free Plastic DIP
J = PLCC
JN = Lead-free PLCC
S = SOIC
3
Specifications GAL16V8
Output Logic Macrocell (OLMC)
The following discussion pertains to configuring the output logic
macrocell. It should be noted that actual implementation is accomplished by development software/hardware and is completely transparent to the user.
There are three global OLMC configuration modes possible:
simple, complex, and registered. Details of each of these modes
are illustrated in the following pages. Two global bits, SYN and
AC0, control the mode configuration for all macrocells. The XOR
bit of each macrocell controls the polarity of the output in any of the
three modes, while the AC1 bit of each of the macrocells controls
the input/output configuration. These two global and 16 individual architecture bits define all possible configurations in a GAL16V8
. The information given on these architecture bits is only to give
a better understanding of the device. Compiler software will transparently set these architecture bits from the pin definitions, so the
user should not need to directly manipulate these architecture bits.
The following is a list of the PAL architectures that the GAL16V8
can emulate. It also shows the OLMC mode under which the
GAL16V8 emulates the PAL architecture.
PAL Architectures
Emulated by GAL16V8
GAL16V8
Global OLMC Mode
16R8
16R6
16R4
16RP8
16RP6
16RP4
Registered
Registered
Registered
Registered
Registered
Registered
16L8
16H8
16P8
Complex
Complex
Complex
10L8
12L6
14L4
16L2
10H8
12H6
14H4
16H2
10P8
12P6
14P4
16P2
Simple
Simple
Simple
Simple
Simple
Simple
Simple
Simple
Simple
Simple
Simple
Simple
Compiler Support for OLMC
as clock and output enable, respectively. These pins cannot be configured as dedicated inputs in the registered mode.
Software compilers support the three different global OLMC modes
as different device types. These device types are listed in the table
below. Most compilers have the ability to automatically select the
device type, generally based on the register usage and output
enable (OE) usage. Register usage on the device forces the software to choose the registered mode. All combinatorial outputs with
OE controlled by the product term will force the software to choose
the complex mode. The software will choose the simple mode only
when all outputs are dedicated combinatorial without OE control.
The different device types listed in the table can be used to override
the automatic device selection by the software. For further details,
refer to the compiler software manuals.
In complex mode pin 1 and pin 11 become dedicated inputs and
use the feedback paths of pin 19 and pin 12 respectively. Because
of this feedback path usage, pin 19 and pin 12 do not have the
feedback option in this mode.
In simple mode all feedback paths of the output pins are routed
via the adjacent pins. In doing so, the two inner most pins ( pins
15 and 16) will not have the feedback option as these pins are
always configured as dedicated combinatorial output.
When using compiler software to configure the device, the user
must pay special attention to the following restrictions in each mode.
In registered mode pin 1 and pin 11 are permanently configured
ABEL
CUPL
LOG/iC
OrCAD-PLD
PLDesigner
TANGO-PLD
Registered
Complex
Simple
Auto Mode Select
P16V8R
G16V8MS
GAL16V8_R
"Registered"1
P16V8R2
G16V8R
P16V8C
G16V8MA
GAL16V8_C7
"Complex"1
P16V8C2
G16V8C
P16V8AS
G16V8AS
GAL16V8_C8
"Simple"1
P16V8C2
G16V8AS3
P16V8
G16V8
GAL16V8
GAL16V8A
P16V8A
G16V8
1) Used with Configuration keyword.
2) Prior to Version 2.0 support.
3) Supported on Version 1.20 or later.
4
Specifications GAL16V8
Registered Mode
In the Registered mode, macrocells are configured as dedicated
registered outputs or as I/O functions.
Dedicated input or output functions can be implemented as subsets of the I/O function.
Architecture configurations available in this mode are similar to the
common 16R8 and 16RP4 devices with various permutations of
polarity, I/O and register placement.
Registered outputs have eight product terms per output. I/O's have
seven product terms per output.
The JEDEC fuse numbers, including the User Electronic Signature
(UES) fuses and the Product Term Disable (PTD) fuses, are shown
on the logic diagram on the following page.
All registered macrocells share common clock and output enable
control pins. Any macrocell can be configured as registered or I/
O. Up to eight registers or up to eight I/O's are possible in this mode.
CLK
Registered Configuration for Registered Mode
D
XOR
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this output configuration.
- Pin 1 controls common CLK for the registered outputs.
- Pin 11 controls common OE for the registered outputs.
- Pin 1 & Pin 11 are permanently configured as CLK &
OE for registered output configuration.
Q
Q
OE
Combinatorial Configuration for Registered Mode
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this output configuration.
- Pin 1 & Pin 11 are permanently configured as CLK &
OE for registered output configuration.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
5
Specifications GAL16V8
Registered Mode Logic Diagram
DIP & PLCC Package Pinouts
1
0
4
8
12
16
20
24
28
2128
PTD
0000
OLMC
0224
19
XOR-2048
AC1-2120
2
0256
OLMC
0480
18
XOR-2049
AC1-2121
3
0512
OLMC
0736
17
XOR-2050
AC1-2122
4
0768
OLMC
0992
16
XOR-2051
AC1-2123
5
1024
OLMC
1248
15
XOR-2052
AC1-2124
6
1280
OLMC
1504
14
XOR-2053
AC1-2125
7
1536
OLMC
1760
13
XOR-2054
AC1-2126
8
1792
OLMC
2016
XOR-2055
AC1-2127
9
2191
SYN-2192
AC0-2193
6
12
OE
11
Specifications GAL16V8
Complex Mode
In the Complex mode, macrocells are configured as output only or
I/O functions.
bility. Designs requiring eight I/O's can be implemented in the
Registered mode.
Architecture configurations available in this mode are similar to the
common 16L8 and 16P8 devices with programmable polarity in
each macrocell.
All macrocells have seven product terms per output. One product
term is used for programmable output enable control. Pins 1 and
11 are always available as data inputs into the AND array.
Up to six I/O's are possible in this mode. Dedicated inputs or
outputs can be implemented as subsets of the I/O function. The
two outer most macrocells (pins 12 & 19) do not have input capa-
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram on the following page.
Combinatorial I/O Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1.
- Pin 13 through Pin 18 are configured to this function.
XOR
Combinatorial Output Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1.
- Pin 12 and Pin 19 are configured to this function.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
7
Specifications GAL16V8
Complex Mode Logic Diagram
DIP & PLCC Package Pinouts
1
2128
0
4
8
12
16
20
24
28
PTD
0000
OLMC
19
XOR-2048
AC1-2120
0224
2
0256
OLMC
18
XOR-2049
AC1-2121
0480
3
0512
OLMC
17
XOR-2050
AC1-2122
0736
4
0768
OLMC
16
XOR-2051
AC1-2123
0992
5
1024
OLMC
15
XOR-2052
AC1-2124
1248
6
1280
OLMC
14
XOR-2053
AC1-2125
1504
7
1536
OLMC
13
XOR-2054
AC1-2126
1760
8
1792
OLMC
12
XOR-2055
AC1-2127
2016
9
11
2191
SYN-2192
AC0-2193
8
Specifications GAL16V8
Simple Mode
Pins 1 and 11 are always available as data inputs into the AND
array. The center two macrocells (pins 15 & 16) cannot be used
as input or I/O pins, and are only available as dedicated outputs.
In the Simple mode, macrocells are configured as dedicated inputs
or as dedicated, always active, combinatorial outputs.
Architecture configurations available in this mode are similar to the
common 10L8 and 12P6 devices with many permutations of generic output polarity or input choices.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram.
All outputs in the simple mode have a maximum of eight product
terms that can control the logic. In addition, each output has programmable polarity.
Combinatorial Output with Feedback Configuration
for Simple Mode
Vcc
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- All OLMC except pins 15 & 16 can be configured to
this function.
XOR
Combinatorial Output Configuration for Simple Mode
Vcc
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- Pins 15 & 16 are permanently configured to this
function.
XOR
Dedicated Input Configuration for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this configuration.
- All OLMC except pins 15 & 16 can be configured to
this function.
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
9
Specifications GAL16V8
Simple Mode Logic Diagram
DIP & PLCC Package Pinouts
1
2128
0
4
8
12
16
20
24
28
PTD
0000
OLMC
XOR-2048
AC1-2120
0224
19
2
0256
OLMC
XOR-2049
AC1-2121
0480
18
3
0512
OLMC
XOR-2050
AC1-2122
0736
17
4
0768
OLMC
XOR-2051
AC1-2123
0992
16
5
OLMC
1024
XOR-2052
AC1-2124
1248
15
6
OLMC
1280
XOR-2053
AC1-2125
1504
14
7
1536
OLMC
XOR-2054
AC1-2126
1760
13
8
1792
OLMC
XOR-2055
AC1-2127
2016
9
12
11
2191
SYN-2192
AC0-2193
10
Specifications GAL16V8D
Absolute Maximum Ratings(1)
Recommended Operating Conditions
Supply voltage VCC ...................................... –0.5 to +7V
Input voltage applied .......................... –2.5 to VCC +1.0V
Off-state output voltage applied ......... –2.5 to VCC +1.0V
Storage Temperature ................................ –65 to 150°C
Ambient Temperature with
Power Applied ........................................ –55 to 125°C
Commercial Devices:
Ambient Temperature (TA) ............................... 0 to 75°C
Supply voltage (VCC)
with Respect to Ground ..................... +4.75 to +5.25V
Industrial Devices:
Ambient Temperature (TA) ........................... –40 to 85°C
Supply voltage (VCC)
with Respect to Ground ..................... +4.50 to +5.50V
1.Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device at
these or at any other conditions above those indicated in the
operational sections of this specification is not implied (while
programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
VIL
VIH
IIL1
IIH
VOL
VOH
IOL
MIN.
TYP.3
MAX.
UNITS
Input Low Voltage
Vss – 0.5
—
0.8
V
Input High Voltage
2.0
—
Vcc+1
V
PARAMETER
CONDITION
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (MAX.)
—
—
–100
μA
Input or I/O High Leakage Current
3.5V ≤ VIN ≤ VCC
—
—
10
μA
Output Low Voltage
IOL = MAX. Vin = VIL or VIH
—
—
0.5
V
Output High Voltage
IOH = MAX. Vin = VIL or VIH
2.4
—
—
V
L-3/-5 & -7 (Ind. PLCC)
—
—
16
mA
L-7 (Except Ind. PLCC)/-10/-15/-25
—
—
24
mA
—
—
–3.2
mA
–30
—
–150
mA
Low Level Output Current
Q-10/-15/-20/-25
IOH
IOS2
High Level Output Current
Output Short Circuit Current
COMMERCIAL
ICC
Operating Power
Supply Current
INDUSTRIAL
ICC
Operating Power
Supply Current
VCC = 5V
VOUT = 0.5V TA= 25°C
VIL = 0.5V VIH = 3.0V
L -3/-5/-7/-10
—
75
115
mA
ftoggle = 15MHz Outputs Open
L-15/-25
—
75
90
mA
Q-10/-15/-25
—
45
55
mA
VIL = 0.5V VIH = 3.0V
L -7/-10/-15/-25
—
75
130
mA
ftoggle = 15MHz Outputs Open
Q -20/-25
—
45
65
mA
1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and TA = 25 °C
11
Specifications GAL16V8D
AC Switching Characteristics
Over Recommended Operating Conditions
PARAMETER
tpd
tco
tcf2
tsu
th
fmax3
twh
twl
ten
tdis
TEST
COND1.
COM
COM
COM / IND
-3
-5
-7
DESCRIPTION
MIN. MAX. MIN. MAX. MIN. MAX.
UNITS
A
Input or I/O to Comb. Output
1
3.5
1
5
1
7.5
ns
A
Clock to Output Delay
1
3
1
4
1
5
ns
—
Clock to Feedback Delay
—
2.5
—
3
—
3
ns
—
Setup Time, Input or Feedback before Clock↑
2.5
—
3
—
5
—
ns
—
Hold Time, Input or Feedback after Clock↑
0
—
0
—
0
—
ns
A
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
182
— 142.8 —
100
—
MHz
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
200
—
166
—
125
—
MHz
A
Maximum Clock Frequency with
No Feedback
250
—
166
—
125
—
MHz
—
Clock Pulse Duration, High
24
—
34
—
4
—
ns
—
3
4
—
4
—
ns
4
—
Clock Pulse Duration, Low
2
B
Input or I/O to Output Enabled
—
4.5
1
6
1
9
ns
B
OE to Output Enabled
—
4.5
1
6
1
6
ns
C
Input or I/O to Output Disabled
—
4.5
1
5
1
9
ns
C
OE to Output Disabled
—
4.5
1
5
1
6
ns
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section. Characterized but not 100% tested.
4) Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
MAXIMUM*
UNITS
TEST CONDITIONS
CI
Input Capacitance
8
pF
VCC = 5.0V, VI = 2.0V
CI/O
I/O Capacitance
8
pF
VCC = 5.0V, VI/O = 2.0V
*Characterized but not 100% tested.
12
Specifications
Specifications
GAL16V8D
GAL16V8
AC Switching Characteristics
Over Recommended Operating Conditions
PARAM.
TEST
COND1.
tpd
tco
tcf2
tsu
th
fmax3
twh
twl
ten
t
tdis
t
COM / IND
COM / IND
IND
COM / IND
-10
-15
-20
-25
DESCRIPTION
MIN.
MAX. MIN.
MAX. MIN.
MAX. MIN.
MAX.
UNITS
A
Input or I/O to Comb. Output
3
10
3
15
3
20
3
25
ns
A
Clock to Output Delay
2
7
2
10
2
11
2
12
ns
—
Clock to Feedback Delay
—
6
—
8
—
9
—
10
ns
—
Setup Time, Input or Fdbk before Clk↑
7.5
—
12
—
13
—
15
—
ns
—
Hold Time, Input or Fdbk after Clk↑
0
—
0
—
0
—
0
—
ns
A
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
66.7
—
45.5
—
41.6
—
37
—
MHz
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
71.4
—
50
—
45.4
—
40
—
MHz
A
Maximum Clock Frequency with
No Feedback
83.3
—
62.5
—
50
—
41.6
—
MHz
—
Clock Pulse Duration, High
6
—
8
—
10
—
12
—
ns
—
Clock Pulse Duration, Low
6
—
8
—
10
—
12
—
ns
B
Input or I/O to Output Enabled
1
10
—
15
—
18
—
20
ns
B
OE to Output Enabled
1
10
—
15
—
18
—
20
ns
C
Input or I/O to Output Disabled
1
10
—
15
—
18
—
20
ns
C
OE to Output Disabled
1
10
—
15
—
18
—
20
ns
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section. Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
MAXIMUM*
UNITS
TEST CONDITIONS
CI
Input Capacitance
8
pF
VCC = 5.0V, VI = 2.0V
CI/O
I/O Capacitance
8
pF
VCC = 5.0V, VI/O = 2.0V
*Characterized but not 100% tested.
13
Specifications GAL16V8
Switching Waveforms
INPUT or
I/O FEEDBACK
VALID INPUT
tsu
th
CLK
INPUT or
I/O FEEDBACK
tco
VALID INPUT
REGISTERED
OUTPUT
tpd
1/fmax
(external fdbk)
COMBINATIONAL
OUTPUT
Combinatorial Output
Registered Output
INPUT or
I/O FEEDBACK
OE
tdis
ten
tdis
COMBINATIONAL
OUTPUT
ten
REGISTERED
OUTPUT
OE to Output Enable/Disable
Input or I/O to Output Enable/Disable
twh
twl
CLK
1/ fmax (internal fdbk)
CLK
tcf
1/ fmax
(w/o fb)
REGISTERED
FEEDBACK
Clock Width
fmax with Feedback
14
tsu
Specifications GAL16V8
fmax Descriptions
CLK
CLK
LOGIC
ARRAY
REGISTER
LOGIC
ARRAY
tsu
tco
REGISTER
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback is calculated from measured
tsu and tco.
t cf
t pd
CLK
fmax with Internal Feedback 1/(tsu+tcf)
LOGIC
ARRAY
REGISTER
Note: tcf is a calculated value, derived by subtracting tsu from
the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The
value of tcf is used primarily when calculating the delay from
clocking a register to a combinatorial output (through registered
feedback), as shown above. For example, the timing from clock
to a combinatorial output is equal to tcf + tpd.
tsu + th
fmax with No Feedback
Note: fmax with no feedback may be less than 1/(twh + twl). This
is to allow for a clock duty cycle of other than 50%.
Switching Test Conditions
GND to 3.0V
Input Pulse Levels
Input Rise
and Fall Times
GAL16V8D-10
(and slower)
2 – 3ns 10% – 90%
+5V
GAL16V8D-3/-5/-7
1.5ns 10% – 90%
R1
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
3-state levels are measured 0.5V from
steady-state active level.
1.5V
1.5V
See figure at right
FROM OUTPUT (O/Q)
UNDER TEST
Table 2-0003/16V8
TEST POINT
R2
C L*
GAL16V8D (except -3) Output Load Conditions (see figure
above)
Test Condition
A
B
C
Active High
Active Low
Active High
Active Low
R1
R2
CL
200Ω
∞
200Ω
∞
200Ω
390Ω
390Ω
390Ω
390Ω
390Ω
50pF
50pF
50pF
5pF
5pF
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
15
Specifications GAL16V8
Switching Test Conditions (Continued)
GAL16V8D-3 Output Load Conditions (see figure at right)
Test Condition
A
B
C
High Z to Active High at 1.9V
High Z to Active Low at 1.0V
Active High to High Z at 1.9V
Active Low to High Z at 1.0V
R1
CL
50Ω
50Ω
50Ω
50Ω
50Ω
35pF
35pF
35pF
35pF
35pF
+1.45V
TEST POINT
FROM OUTPUT (O/Q)
UNDER TEST
R1
Z0 = 50Ω, CL = 35pF*
*CL includes test fixture and probe capacitance.
Electronic Signature
Output Register Preload
An electronic signature is provided in every GAL16V8 device. It
contains 64 bits of reprogrammable memory that can contain user
defined data. Some uses include user ID codes, revision numbers,
or inventory control. The signature data is always available to the
user independent of the state of the security cell.
When testing state machine designs, all possible states and state
transitions must be verified in the design, not just those required
in the normal machine operations. This is because, in system
operation, certain events occur that may throw the logic into an
illegal state (power-up, line voltage glitches, brown-outs, etc.). To
test a design for proper treatment of these conditions, a way must
be provided to break the feedback paths, and force any desired (i.e.,
illegal) state into the registers. Then the machine can be sequenced
and the outputs tested for correct next state conditions.
NOTE: The electronic signature is included in checksum calculations. Changing the electronic signature will alter the checksum.
Security Cell
GAL16V8 devices include circuitry that allows each registered
output to be synchronously set either high or low. Thus, any present
state condition can be forced for test sequencing. If necessary,
approved GAL programmers capable of executing text vectors
perform output register preload automatically.
A security cell is provided in the GAL16V8 devices to prevent unauthorized copying of the array patterns. Once programmed, this
cell prevents further read access to the functional bits in the device.
This cell can only be erased by re-programming the device, so the
original configuration can never be examined once this cell is programmed. The Electronic Signature is always available to the user,
regardless of the state of this control cell.
Input Buffers
GAL16V8 devices are designed with TTL level compatible input
buffers. These buffers have a characteristically high impedance,
and present a much lighter load to the driving logic than bipolar TTL
devices.
Latch-Up Protection
GAL16V8 devices are designed with an on-board charge pump
to negatively bias the substrate. The negative bias minimizes the
potential of latch-up caused by negative input undershoots. Additionally, outputs are designed with n-channel pull-ups instead of
the traditional p-channel pull-ups in order to eliminate latch-up due
to output overshoots.
The GAL16V8 input and I/O pins have built-in active pull-ups. As
a result, unused inputs and I/O's will float to a TTL "high" (logical
"1"). Lattice Semiconductor recommends that all unused inputs
and tri-stated I/O pins be connected to another active input, VCC,
or Ground. Doing this will tend to improve noise immunity and reduce ICC for the device.
Device Programming
GAL devices are programmed using a Lattice Semiconductorapproved Logic Programmer, available from a number of manufacturers. Complete programming of the device takes only a few
seconds. Erasing of the device is transparent to the user, and is
done automatically as part of the programming cycle.
I n p u t C u r r e n t (u A )
Typical Input Pull-up Characteristic
0
-20
-40
-60
0
1.0
2.0
3.0
In p u t V o lt ag e ( V o lt s)
16
4.0
5.0
Specifications GAL16V8
Power-Up Reset
Vcc
Vcc (min.)
t su
t wl
CLK
t pr
INTERNAL REGISTER
Q - OUTPUT
Internal Register
Reset to Logic "0"
FEEDBACK/EXTERNAL
OUTPUT REGISTER
Device Pin
Reset to Logic "1"
Circuitry within the GAL16V8 provides a reset signal to all registers during power-up. All internal registers will have their Q
outputs set low after a specified time (tpr, 1μs MAX). As a result,
the state on the registered output pins (if they are enabled) will
always be high on power-up, regardless of the programmed
polarity of the output pins. This feature can greatly simplify state
machine design by providing a known state on power-up. Because of the asynchronous nature of system power-up, some
conditions must be met to provide a valid power-up reset of the
device. First, the VCC rise must be monotonic. Second, the clock
input must be at static TTL level as shown in the diagram during
power up. The registers will reset within a maximum of tpr time.
As in normal system operation, avoid clocking the device until all
input and feedback path setup times have been met. The clock
must also meet the minimum pulse width requirements.
Input/Output
Equivalent
Schematics
INPUT/OUTPUT
EQUIVALENT
SCHEMATICS
PIN
PIN
Feedback
Vcc
Active Pull-up
Circuit
Active Pull-up
Circuit
Vcc
ESD
Protection
Circuit
Vref
Tri-State
Control
Vcc
Vcc
Vref
Data
Output
PIN
PIN
ESD
Protection
Circuit
Typ. Vref = 3.2V
Typ. Vref = 3.2V
Typical Input
Feedback
(To Input Buffer)
Typical Output
17
Specifications GAL16V8
GAL16V8D-3/-5/-7 (IND PLCC): Typical AC and DC Characteristic Diagrams
Normalized Tco vs Vcc
Normalized Tpd vs Vcc
1
0.9
0.8
4.50
4.75
5.00
5.25
RISE
FALL
1.1
1
0.9
0.8
4.50
5.50
4.75
Supply Voltage (V)
Normalized Tpd vs Temp
0.8
25
50
75
100
1.2
1
0.9
0.8
0.7
-55
125
-25
0
25
50
75
100
1.2
1.1
0
-0.1
-0.1
-0.2
RISE
FALL
-0.3
-0.4
0.9
0.8
0.7
-55
125
-25
0
4
5
6
7
-0.2
RISE
FALL
-0.3
8
1
Number of Outputs Switching
2
3
4
5
6
7
8
Number of Outputs Switching
Delta Tpd vs Output Loading
Delta Tco vs Output Loading
14
14
12
12
Delta Tco (ns)
RISE
FALL
10
8
6
4
2
RISE
FALL
10
8
6
4
2
0
0
-2
-2
0
50
100
150
200
250
0
3 00
50
100
150
200
Output Loading (pF)
Output Loading (pF)
18
25
50
75
Temperature (deg. C)
-0.4
3
5.50
1
Delta Tco vs # of Outputs
Switching
0
2
5.25
PTH->L
PT L->H
Temperature (deg. C)
Delta Tpd vs # of Outputs
Switching
1
5.00
Normalized Tsu vs Temp
RISE
FALL
1.1
Temperature (deg. C)
Delta Tpd (ns)
4.75
Supply Voltage (V)
1.3
Delta Tco (ns)
0
0.9
0.8
4.50
5.50
Normalized Tsu
Normalized Tco
0.9
-25
1
Normalized Tco vs Temp
PT H->L
PT L->H
Delta Tpd (ns)
Normalized Tpd
5.25
1.3
1
0.7
-55
5.00
PT H->L
PT L->H
1.1
Supply Voltage (V)
1.3
1.1
Normalized Tsu
PT H->L
PT L->H
1.1
1.2
Normalized Tsu vs Vcc
1.2
1.2
Normalized Tco
Normalized Tpd
1.2
250
3 00
1 00
1 25
Specifications GAL16V8
GAL16V8D-3/-5/-7 (IND PLCC): Typical AC and DC Characteristic Diagrams
Voh vs Ioh
Voh vs Ioh
Vol vs Iol
1
3.25
5
4
0.75
0.5
0.25
Voh (V)
Voh (V)
Vol (V)
3
3
2
2.75
1
0
0
0
10
20
30
2.5
0
40
10
20
30
40
50
0
Normalized Icc vs Vcc
Normalized Icc vs Temp
0.9
5.00
5.25
1.15
1.1
1
0.9
0.8
-55
5.50
Supply Voltage (V)
0
25
50
75
100
125
10
Iik (mA)
Delta Icc (mA)
20
6
4
30
40
50
60
70
2
80
0
0
0.5
1
1.5
2
2.5
Vin (V)
3
3.5
4
90
-2
1
-1.5
-1
Vik (V)
19
-0.5
0
25
50
75
Frequency (MHz)
0
8
1.05
0.9
-25
Input Clamp (Vik)
Delta Icc vs Vin (1 input)
1.1
0.95
Temperature (deg. C)
10
4
Normalized Icc vs Freq.
Normalized Icc
Normalized Icc
Normalized Icc
1
3
1.2
1.2
1.1
4.75
2
Ioh (mA)
1.3
1.2
0.8
4.50
1
Ioh (mA)
Iol (mA)
0
1 00
Specifications GAL16V8
GAL16V8D-7 (Except IND PLCC)/-10L: Typical AC and DC Characteristic Diagrams
Normalized Tpd vs Vcc
1.05
1
0.95
0.9
4.5
RISE
FALL
1.1
1.05
1
0.95
5
5.25
5.5
4.5
1
0.9
4.75
5
5.25
4.5
5.5
Normalized Tpd vs Temp
1
0.9
25
50
75
100
RISE
FALL
1.2
1.1
1
0.9
0.8
-55
125
-25
Temperature (deg. C)
0
25
50
Delta Tpd vs # of Outputs Switching
Delta Tpd (ns)
75
1.1
1
0.9
0.8
-55
125
-25
0
-0.1
-0.1
-0.2
-0.2
-0.3
-0.4
-0.5
-0.6
RISE
FALL
-0.7
-0.8
0
-0.3
-0.4
-0.5
-0.6
RISE
FALL
-0.7
-0.8
-0.9
-0.9
-1
-1
1
2
3
4
5
6
7
8
1
Number of Outputs Switching
2
3
4
5
6
7
8
Number of Outputs Switching
Delta Tpd vs Output Loading
Delta Tco vs Output Loading
12
12
Delta Tco (ns)
RISE
FALL
8
4
0
RISE
FALL
8
4
0
-4
-4
0
50
100
150
200
250
0
3 00
50
100
150
200
250
Output Loading (pF)
Output Loading (pF)
20
25
50
75
1 00
Temperature (deg. C)
Delta Tco vs # of Outputs Switching
0
Delta Tpd (ns)
100
RISE
FALL
1.2
Temperature (deg. C)
Delta Tco (ns)
0
5.5
1.3
Normalized Tsu
Normalized Tco
1.1
5.25
Normalized Tsu vs Temp
Normalized Tco vs Temp
RISE
FALL
5
Supply Voltage (V)
1.3
-25
4.75
Supply Voltage (V)
1.3
1.2
RISE
FALL
1.1
0.8
0.9
4.75
Supply Voltage (V)
Normalized Tpd
Normalized Tsu
RISE
FALL
Normalized Tco
Normalized Tpd
1.2
1.15
1.1
0.8
-55
Normalized Tsu vs Vcc
Normalized Tco vs Vcc
1.15
3 00
1 25
Specifications GAL16V8
GAL16V8D-7 (Except IND PLCC)/-10L: Typical AC and DC Characteristic Diagrams
Voh vs Ioh
Vol vs Iol
0.4
4
3
0.2
Voh (V)
3.5
Voh (V)
0.3
Vol (V)
Voh vs Ioh
4
0.5
2
3
1
0.1
0
0
1
6
11
16
21
0
26
5
10
Normalized Icc vs Vcc
0.9
0.8
3.45
1.15
1.1
1.1
1
0.9
0.8
-55
3.6
0
8
10
7
20
6
30
Iik (mA)
Delta Icc (mA)
25
50
88
1 00
1 25
5
4
3
40
50
60
2
70
1
80
0
90
0.5
1
1.5
2
2.5
3
Vin (V)
3.5
4
4.5
5
-3
4.00
5.00
1.05
1
-2.5
-2
-1.5
Vik (V)
21
-1
-0.5
1
15
25
50
Frequency (MHz)
Input Clamp (Vik)
Delta Icc vs Vin (1 input)
0
3.00
0.95
-25
Temperature (deg. C)
9
2.00
Normalized Icc vs Freq
1.2
Supply Voltage (V)
0
1.00
Ioh (mA)
Normalized Icc
Normalized Icc
Normalized Icc
1
3.3
2.5
0.00
25
Normalized Icc vs Temp
1.1
3.15
20
Ioh (mA)
Iol (mA)
3
15
0
75
1 00
Specifications GAL16V8
GAL16V8D-10Q (and Slower): Typical AC and DC Characteristic Diagrams
Normalized Tpd vs Vcc
PT H->L
PT L->H
1
0.9
0.8
4.50
4.75
5.00
5.25
RISE
FALL
1.1
1
0.9
0.8
4.50
5.50
4.75
Supply Voltage (V)
5.00
5.25
0.8
50
75
100
1.1
1
0.9
0.8
0.7
-55
125
-25
Temperature (deg. C)
0
25
50
75
Delta Tpd (ns)
0
-0.2
-0.2
-0.4
-0.6
-0.8
RISE
FALL
1
0.8
0.7
-55
125
-25
0
4
5
6
7
-0.4
-0.6
-0.8
RISE
FALL
1
8
Number of Outputs Switching
2
3
4
5
6
7
8
Number of Outputs Switching
Delta Tpd vs Output Loading
Delta Tco vs Output Loading
12
12
10
10
6
Delta Tco (ns)
RISE
FALL
8
4
2
0
-2
RISE
FALL
8
6
4
2
0
-2
-4
-4
-6
0
50
100
150
200
250
0
300
50
100
150
200
250
Output Loading (pF)
Output Loading (pF)
22
25
50
75
100
Temperature (deg. C)
-1.2
3
5.50
0.9
-1
-1.2
2
5.25
PT H->L
PT L->H
1.1
Delta Tco vs # of Outputs
Switching
0
-1
Delta Tpd (ns)
100
1.2
Temperature (deg. C)
Delta Tpd vs # of Outputs
Switching
1
5.00
Normalized Tsu vs Temp
RISE
FALL
Delta Tco (ns)
25
4.75
Supply Voltage (V)
Normalized Tsu
1
0.9
0
0.9
1.3
1.2
Normalized Tco
PT H->L
PT L->H
-25
1
0.8
4.50
5.50
1.3
1.1
PT H->L
PT L->H
Normalized Tco vs Temp
Normalized Tpd vs Temp
1.2
1.1
Supply Voltage (V)
1.3
Normalized Tpd
Normalized Tsu
Normalized Tco
Normalized Tpd
1.2
1.2
1.1
0.7
-55
Normalized Tsu vs Vcc
Normalized Tco vs Vcc
1.2
300
125
Specifications GAL16V8
GAL16V8D-10Q (and Slower): Typical AC and DC Characteristic Diagrams
Voh vs Ioh
Vol vs Iol
Vol (V)
Voh (V)
0.4
0.2
Voh vs Ioh
5
4
4
3.8
Voh (V)
0.6
3
2
1
0
10
20
30
3
0
40
10
20
Normalized Icc vs Vcc
40
50
1
0.9
5.25
1.4
1.2
1.3
1.1
1
0.9
0.7
-55
5.50
Supply Voltage (V)
0
25
50
75
100
125
Iik (mA)
Delta Icc (mA)
10
6
20
30
40
2
50
0
60
0
0.5
1
1.5
2
2.5
Vin (V)
3
3.5
4
-2
1.2
1.1
1
-1.5
-1
Vik (V)
23
-0.5
0
25
50
75
Frequency (MHz)
0
4
4
0.8
-25
Input Clamp (Vik)
8
3
0.9
Temperature (deg. C)
Delta Icc vs Vin (1 input)
2
Normalized Icc vs Freq.
1.3
0.8
5.00
1
Ioh (mA)
Normalized Icc
Normalized Icc
1.1
4.75
0
Normalized Icc vs Temp
1.2
Normalized Icc
30
Ioh (mA)
Iol (mA)
0.8
4.50
3.4
3.2
0
0
3.6
0
100
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