datasheet for 5043/BEA by Rochester Electronics

datasheet for 5043/BEA by Rochester Electronics
INCH-POUND
MIL-M-38510/105A
23 January 2006
SUPERSEDING
MIL-M-38510/105
23 December 1980
MILITARY SPECIFICATION
MICROCIRCUITS, LINEAR, CMOS, HIGH LEVEL ANALOG SWITCH WITH DRIVER, MONOLITHIC SILICON
This specification is approved for use by all Departments and Agencies of the Department of Defense.
Inactive for new design after 10 July 1995.
The requirement for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for silicon, CMOS, monolithic, analog switches. Two
product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the
complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF38535, (see 6.4)
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
Device type
01
02
03
04
05
06
07
08
Circuit
One-channel, 75 ohm, SPST switch
Two-channel, 75 ohm, SPST switch
One-channel, 75 ohm, SPDT switch
Two-channel, 75 ohm, SPDT switch
One-channel, 75 ohm, DPST switch
Two-channel, 75 ohm, DPST switch
One-channel, 75 ohm, DPDT switch
One-channel, 75 ohm, 4PST switch
NOTE: A channel is defined as a driver with associated switches.
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outline. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
A 1/
E
I
1/
Descriptive designator
GDFP5-F14 or CDFP6-F14
GDIP1-T16 or CDIP2-T16
MACY1-X10
Terminals
14
16
10
Package style
Flat pack
Dual-in-line
Can
Inactive for new design. Acceptable only for use in equipment designed or redesigned on or
before 29 November 1986.
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43218-3990, or email
[email protected] Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at http://assist.daps.dla.mil.
AMSC N/A
FSC 5962
MIL-M-38510/105A
1.3 Absolute maximum ratings.
V+ - V- ......................................................................................................................
V+ - VD ....................................................................................................................
VD - V- .....................................................................................................................
VD - VS .....................................................................................................................
VL – V- .....................................................................................................................
VL – VIN ...................................................................................................................
VL – VR ....................................................................................................................
VIN – VR ...................................................................................................................
VR – V- .....................................................................................................................
VR – VIN ...................................................................................................................
Current (any terminal except S or D) .......................................................................
Storage temperature ................................................................................................
Lead temperature (soldering, 60 seconds) ...............................................................
Junction temperature (TJ ) ........................................................................................
33 V dc
30 V dc
30 V dc
±22 V dc
33 V dc
30 V dc
20 V dc
20 V dc
33 V dc
2 V dc
30 mA
-65°C to +150°C
+300°C
+175°C
1.4 Recommended operating conditions.
+VCC ........................................................................................................................
-VCC .......................................................................................................................
........................................................................................................................
VR
VL
.......................................................................................................................
Ambient operating temperature range (TA) ..............................................................
+15 V dc
-15 V dc
0 V dc
5 V dc
-55°C ≤ TA ≤ +125°C
1.5 Power and thermal characteristics.
2/
3/
Case outline
Maximum allowable
power dissipation 2/
Maximum θJC 3/
Maximum θJA
A
350 mW at TA = 125°C
60°C/W
140°C/W
E
400 mW at TA = 125°C
35°C/W
120°C/W
I
350 mW at TA = 125°C
40°C/W
140°C/W
All leads welded or soldered to PC board.
Applies only when TA ≥ 75°C.
2
MIL-M-38510/105A
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.1.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this
specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those
cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535
- Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
- Test Method Standard for Microelectronics.
- Interface Standard Electronic Component Case Outlines.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
Philadelphia, PA 19111-5094.
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein the text of this document shall take precedence. Nothing in this document, however, supersedes applicable
laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.3).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Circuit diagram and terminal connections. The circuit diagram and terminal connections shall be as specified
on figure 1.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying activity and the preparing activity upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I,
and apply over the full recommended ambient operating temperature range, unless otherwise specified.
3
MIL-M-38510/105A
3.5.1 Switch operation. The analog switches listed below are guaranteed to turn “on” with either a “low” input
( VR ≤ VIL ≤ 0.8 V ) or “high” input (2.4 V ≤ VIH ≤ VIL ) as specified below (see figure 1).
Device types
VIN
Channels ON
01
2.4 V dc
1
Channels OFF
0.8 V dc
02, 05, 03
2.4 V dc
1
1, 2
1
0.8 V dc
04
07
06, 08
2
2
1, 2
1
2.4 V dc
1, 2
3, 4
0.8 V dc
3, 4
1, 2
2.4 V dc
2, 3
1, 4
0.8 V dc
1, 4
2, 3
2.4 V dc
1, 2, 3, 4
0.8 V dc
1, 2, 3, 4
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 82 (see MIL-PRF-38535, appendix A).
4
MIL-M-38510/105A
TABLE I. Electrical performance characteristics.
Characteristic
Symbol
Conditions
VCC = ±15 V, GND = 0 V
unless otherwise
specified
Drain-source ON
resistance
RDS
VD = -10 V, IS = 10 mA,
see figure 2
see figure 2
ID(ON)
Min
TA = -55°C, 25°C
TA = -55°C, 25°C
VD = -7.5 V, VCC = ±10 V,
IS = 10 mA, see figure 2
TA = -55°C, 25°C
VD = 7.5 V, VCC = ±10 V,
TA = -55°C, 25°C
IS = -10 mA, see figure 2
TA = 125°C
VS = VD = 10 V,
VD = 10 V, VS = -10 V,
150
150
-200
200
TA = 25°C
-2
+2
TA = -55°C, 125°C
-200
200
TA = 25°C
-2
+2
TA = -55°C, 125°C
-100
100
-1
+1
-100
100
TA = 25°C
-1
+1
TA = -55°C, 125°C
-100
100
-1
+1
-100
100
-1
+1
-1
0
-10
0
0
1
0
10
TA = -55°C, 125°C
nA
nA
All
( see 3.5.1 for VIN ),
See figure 4
VD = -10 V, VS = 10 V,
nA
All
( see 3.5.1 for VIN ),
TA = 25°C
see figure 5
VD = 10 V, VS = -10 V,
TA = -55°C, 125°C
All
( see 3.5.1 for VIN ),
TA = 25°C
see figure 5
VIN = 0 V, see figure 6
TA = -55°C, 25°C
All
TA = 125°C
IIH
75
All
All
VD = -10 V, VS = 10 V,
Input current, input
voltage high
75
All
TA = 25°C
see figure 4
IIL
150
All
( see 3.5.1 for VIN ),
Input current, input
voltage low
75
All
TA = 125°C
( see 3.5.1 for VIN ),
see figure 3
IS(OFF)
Ω 1/
All
VS = VD = -10 V,
Source OFF
leakage current
Max
150
TA = -55°C, 125°C
see figure 3
ID(OFF)
Unit
75
All
TA = 125°C
(see 3.5.1 for VIN ),
Drain OFF leakage
current
Limits
Device
type
TA = 125°C
VD = 10 V, IS = -10 mA,
Channel ON
leakage current
Temperature
range
VIN = 2.4 V, 5 V,
TA = -55°C, 25°C
see figure 6
TA = 125°C
See footnotes at end of table.
5
All
µA
µA
MIL-M-38510/105A
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions
VCC = ±15 V, GND = 0 V
unless otherwise
specified
Positive supply
current
+ICC
Negative supply
current
-ICC
Logic supply
current
+IL
Temperature
range
Min
TA = -55°C, 25°C
VIN = 0 V, 5 V
see figure 7
Limits
Device
type
All
TA = -55°C, 25°C
see figure 7
TA = -55°C, 25°C
see figure 7
All
+IR
VIN = 0 V, 5 V,
TA = -55°C, 25°C
see figure 7
-100
All
10
Turn ON time
Turn OFF time
tON
tOFF
See figure 8
All
µA
-10
-100
All
375
TA = 25°C
450
TA = 125°C
550
TA = -55°C
See figure 8
µA
100
TA = 125°C
TA = -55°C
µA
-10
TA = 125°C
Reference supply
current
µA
100
TA = 125°C
VIN = 0 V, 5 V,
Max
10
TA = 125°C
VIN = 0 V, 5 V
Unit
All
250
TA = 25°C
250
TA = 125°C
400
ns
ns
f = 1 MHz ,
Single channel
isolation
VISO
VGEN = 1 VP-P,
TA = 25°C
All
50
dB
TA = 25°C
All
50
dB
TA = 25°C
All
-55°C ≤ TA ≤ 125°C
03,04,
07
see figure 9
f = 1 MHz ,
Crosstalk between
channels
VCT
Charge transfer
error
VCTE
VS = GND, see figure 11
Break-before-make
time delay
tD
See figure 12
VGEN = 1 VP-P,
see figure 10
See footnotes at end of table.
6
15
20
mV
ns
MIL-M-38510/105A
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions
VCC = ±15 V, GND = 0 V
unless otherwise
specified
Driver input
capacitance
Switch input
capacitance
Switch output
capacitance
Temperature
range
Device
type
Limits
Unit
CA
VIN = 0 V, see 4.4.1d
TA = 25°C
All
30
pF
CIS
See 4.4.1d, switch off
TA = 25°C
All
20
pF
COS
See 4.4.1d, switch off
TA = 25°C
All
20
pF
1/ The listed resistance limits correspond to the following voltage values:
75 Ω correspond to ±9.25 V and ±6.75 V; 150 Ω correspond to ±8.50 V and ±6.0 V; see table III.
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or
as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not
effect the form, fit, or function as function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior
to qualification and quality conformance inspection. The following additional criteria shall apply:
a.
The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1015 of MIL-STD-883.
b.
Reverse bias burn-in (method 1015 of MIL-STD-883). This screen shall apply to class S only. However,
regardless of device class, for devices 03, 04, and 07, an additional burn-in shall be performed with the logic
level of the switch drivers opposite that used in the first burn-in. Ambient temperature (TA) shall be 125°C
minimum. Duration for reverse bias test shall be 24 hours minimum for class S devices, and duration for
additional burn-in (class B devices) shall be 160 hours minimum.
c.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
d.
For class S devices, post dynamic burn-in, or class B devices, post static burn-in, electrical parameter
measurements may, at the manufacturer’s option, be performed separately or included in the final electrical
parameter measurements.
e.
Additional screening for space level product shall be as specified in MIL-PRF-38535.
7
MIL-M-38510/105A
TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535
test requirements
Class S
devices
Interim electrical parameters
Class B
devices
1
1
1*, 2, 3, 9
Final electrical test parameters
Group A test requirements
Group B electrical test parameters when
using the method 5005 QCI option
Group C end-point electrical
parameters
Additional electrical subgroups for group C
periodic inspections
Group D end-point electrical
parameters
Additional electrical subgroups for group D
periodic inspections
1*, 2, 3, 9
1,2,3,(4,7)**,
9,10,11,
(12,13,14)***
1,2,3 and
table IV delta
limits
1,2,3 and
table IV delta
limits
1,2,3,(4,7)**,
9,10,11,
(12,13,14)***
N/A
N/A
(4, 7)****
1,2,3
1
(4,7)*****
None
1 and
table IV delta
limits
*PDA applies to subgroup 1.
** See 4.4.1e
*** See 4.4.1c
**** See 4.4.3c
***** See 4.4.4b
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 5, 6, and 8 shall be omitted.
c.
Special subgroups shall be added to group A inspection and shall consist of group A subgroups 12, 13, and
14 as specified in table III herein. The sample size series for subgroup 12 shall be 5 with no failures
allowed, for all classes. The sample size series for subgroup 13 shall be 7 for all classes. The sample size
series for subgroup 14 shall be 10 for all classes
d.
CX measurements shall be made only for initial qualification and after process or design changes which may
affect capacitance measurements. Capacitance shall be measured between the designated terminal and
ground at the frequency of 1 MHz. (See method 3012 of MIL-STD-883). CIS and COS tests will be
measured with the switch off (see 3.5.1).
e.
Subgroups 4 and 7 shall be performed for initial qualification only using a sample of 5 devices for each
device type submitted to group A inspection, with no failure allowed. If not more than 1 failure is found in the
first sample of 5, a second sample of 5 is permitted with no further failures allowed.
8
MIL-M-38510/105A
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a.
End point electrical parameters shall be as specified in table II herein.
b.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB)
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883. For device types 03, 04, and 07,
life test duration shall be divided equally between forward bias and reverse bias.
c.
A special subgroup shall be added to group C inspection for class B devices only, and it shall consist of the
group A subgroups 4 and 7 as specified in table III herein. This special subgroup shall be performed on
each device type that is qualified from those listed in 1.2.1 herein. After initial qualification, the special
subgroup shall be performed periodically on a single device type selected from those device types
previously qualified. A sample of 5 devices (of the device type to be inspected) shall be chosen and
submitted to test with no failures allowed. If not more than 1 failure is found in the first sample of 5, a
second sample of 5 is permitted with no further failures allowed. When more than one device type is
qualified, the single device type selected shall be different device type for each subsequent periodic
inspection until all qualified device types have been inspected. The sequence of single device types shall be
repeated to fulfill the periodic inspection requirement.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535.
a.
End point electrical parameters shall be as specified in table II herein.
b.
A special subgroup shall be added to group D inspection for class S devices only, and it shall consist
of the group A subgroups 4 and 7 as specified in table III herein.
c.
A special subgroup shall be added to group D inspection for class S devices only, and it shall consist of the
group A subgroups 4 and 7 as specified in table III herein. This special subgroup shall be performed on
each device type that is qualified from those listed in 1.2.1 herein. After initial qualification, the special
subgroup shall be performed periodically on a single device type selected from those device types
previously qualified. When more than one device type is qualified, the single device type selected shall
be different device type for each subsequent periodic inspection until all qualified device types have been
inspected. The sequence of single device types shall be repeated to fulfill the periodic inspection
requirements.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.
4.5.1 Voltage and current. All voltage values given are referenced to the microcircuit ground terminals. Currents
given are conventional current and positive when flowing into the referenced terminal.
9
MIL-M-38510/105A
Figure 1. Terminal connection.
10
MIL-M-38510/105A
Figure 1. Terminal connection – continued.
11
MIL-M-38510/105A
Figure 1. Terminal connections – Continued.
12
MIL-M-38510/105A
Figure 1. Terminal connections – Continued.
13
MIL-M-38510/105A
Figure 1. Terminal connections – Continued.
14
MIL-M-38510/105A
NOTE: VIN from table I, RDS = (VS – VD) / -10 mA
NOTE: VIN from table I, RDS = (VS – VD) / 10 mA
Figure 2. RDS test circuit.
NOTE: Conditions are from table I.
Figure 3. ID(on) test circuit.
15
MIL-M-38510/105A
NOTE: Test conditions are from table I.
FIGURE 4. ID(off) test circuit.
FIGURE 5. IS(off) test circuit.
NOTE: Test conditions are from table I.
FIGURE 6. IIL, IIH test circuit.
FIGURE 7. I+, I- test circuit.
16
MIL-M-38510/105A
RL = 1 kΩ ±5 %.
CL = 95 pF minimum to 200 pF maximum (includes test jig capacitance).
FIGURE 8. Input output waveforms for time delay tests.
17
MIL-M-38510/105A
NOTES:
1. The logic driver shall have the following characteristics:
a. VLOGIC = 0 V to +3 V for device types 01 through 08.
b. Rise time ( 0.3 V to 2.7 V ) ≤ 10 ns for device types 01 through 08.
Fall time ( 2.7 V to 0.3 V ) ≤ 10 ns for device types 01 through 08.
2. See 3.5.1 for appropriate switching conditions.
3. VSOURCE (VS) = +10 V and -10 V for tON.
VSOURCE (VS) = +10 V and -10 V for tOFF.
4. VX = +8 V for +10 V condition in (3), above.
VX = -8 V for -10 V condition in (3), above.
FIGURE 8. Input output waveforms for time delay tests – Continued.
18
MIL-M-38510/105A
FIGURE 9. Isolation test circuit.
FIGURE 10. Crosstalk test circuit.
FIGURE 11. Charge transfer error test circuit.
19
MIL-M-38510/105A
NOTES:
1. RL = 1 kΩ ±5%, CL = 95 pF minimum to 200 pF maximum.
2. tD1, tD2, tD3, and tD4 shall be measured. These measurements shall apply only to device types 03, 04, and 07.
See 3.5.1 for switch conditions.
3. VSOURCE (VS) = +10 V for condition A (all device types).
VSOURCE (VS) = -10 V for condition B (all device types).
4. VX = +8 V for condition A (all device types).
VX = -8 V for condition B (all device types).
5. The logic driver shall have the following characteristics:
a. VLOGIC = 0 V to 3 V for parts 01 through 08.
b. Rise time (0.3 V to 2.7 V) ≤ 10 ns, for part types 01 through 08.
Fall time (2.7 V to 0.3 V) ≤ 10 ns, for part types 01 through 08.
FIGURE 12. Break-before-make test circuit.
20
MIL-M-38510/105A
FIGURE 13. Test circuit (static and dynamic tests) for device type 01.
21
MIL-M-38510/105A
FIGURE 14. Test circuit (static and dynamic tests) for device type 02.
22
MIL-M-38510/105A
FIGURE 15. Test circuit (static and dynamic tests) for device types 03 and 05.
23
MIL-M-38510/105A
FIGURE 16. Test circuit (static and dynamic tests) for device types 04 and 06.
24
MIL-M-38510/105A
FIGURE 17. Test circuit (static and dynamic tests) for device types 07 and 08.
25
TABLE III. Group A inspection for device type 01.
Symbol
Test
Adapter pin number 1/
Test limits
number
IN
N.C.
1
2
ID(ON)
“
ID(OFF)
“
IS(OFF)
“
IIL
IIH
“
ICC
“
-ICC
“
+IL
“
+IR
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
2.4 V
“
“
“
“
“
0.8 V
“
“
“
0.0 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
VCTE
VCT
22
23
IN 3/
0.8 V
RDS
“
“
“
VISO
tON
tOFF
tON
tOFF
tON
tOFF
CA
CIS
COS
24
25
26
27
28
29
30
31
32
33
2.4 V
IN
IN
IN
IN
IN
IN
0.0 V
S1
N.C.
N.C.
3
4
5
10 mA
-10 mA
10 mA
-10 mA
10.0 V
-10.0 V
-10.0 V
10.0 V
-10.0 V
10.0 V
IN 4/
+VCC
VL
VR
N.C.
10
6
7
8
9
15.0 V
15.0 V
10.0 V
10.0 V
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-15.0 V
-15.0 V
-10. V
-10. V
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
15.0 V
15.0 V
-15.0 V
-15.0 V
+5.0 V
+5.0 V
GND
GND
IN 4/
dBCT = -20 log ( VOUT / VIN )
15.0 V
IN
IN
dBISO = -20 log ( VOUT /VIN )
15.0 V
“
IN
IN
IN
IN
-VCC
15.0 V
“
“
“
“
“
“
D1
N.C.
N.C.
N.C.
11
12
13
14
-10.0 V
10.0 V
-7.5 V
7.5 V
10.0 V
-10.0 V
10.0 V
-10.0 V
10.0 V
-10.0 V
Relays
energized
Measured pin
number
None
“
“
“
K4
K4
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3
3
3
3
3
3
11
11
3
3
1
1
1
6
6
7
7
8
8
9
9
K2
K1
11
11
Unit
Subgroup 1
TA = 25°C
Min
Max
Subgroup 2
TA = 125°C
Min
-9.25
9.25
Max
Subgroup 3
TA = -55°C
Min
-8.50
8.50
Max
-9.25
9.25
-6.75
-6.0
-6.75
6.75
-2
2
-2
2
-1
1
“
“
“
“
“
“
-1
0
0
1
0
1
--10
--10
-10
---10
----10
--10
-10
---10
--Subgroup 4
TA = 25°C
Min
Max
--15
6.0
-200
200
-200
200
-100
100
-100
100
-100
100
-100
100
-10
0
0
10
0
10
--100
--100
-100
---100
----100
--100
-100
---100
--Subgroup 7
TA = 25°C
Min
Max
6.75
-200
200
-200
200
-100
100
-100
100
-100
100
-100
100
-1
0
0
1
0
1
--10
--10
-10
---10
----10
--10
-10
---10
--Subgroup 9
TA = 25°C
Min
Max
mV
3.16
mVPP
dB
3.16
mVPP
dB
ns
ns
50
-15.0 V
+5.0 V
GND
K1
11
50
-15.0 V
“
-15.0 V
“
“
“
“
“
“
+5.0 V
“
+5.0 V
“
“
“
“
“
“
GND
“
GND
“
“
“
“
“
“
OUT
OUT
OUT
OUT
OUT
OUT
K3
K3
K3
“
“
“
None
“
“
1 to 11
1 to 11
1 to 11
“
“
“
1
3
11
Subgroup 10
TA = 125°C
Min
Max
550
400
V 2/
“
“
“
nA
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
Subgroup 11
TA = -55°C
Min
Max
450
250
Subgroup 12
TA = 25°C
Min
Max
375
250
30
20
20
ns
“
“
“
pF
“
“
See footnotes at end of table.
MIL-M-38510/105A
26
TABLE III. Group A inspection for device type 02.
Symbol
RDS
“
“
“
“
“
“
ID(ON)
“
“
“
ID(OFF)
“
“
“
IS(OFF)
“
“
“
IIL
“
IIH
“
“
“
+ICC
“
-ICC
“
+IL
“
+IR
“
Test
number
IN1
N.C.
1
2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
2.4 V
10 mA
2.4 V
-10 mA
2.4 V
10 mA
S2
N.C.
3
4
5
-10 mA
10 mA
2.4 V
-10 mA
2.4 V
10.0 V
-10 mA
10.0 V
2.4 V
-10.0 V
0.8 V
-10.0 V
-10.0 V
-10.0 V
0.8 V
10.0 V
10.0 V
0.8 V
-10.0 V
0.8 V
10.0 V
-10.0 V
10.0 V
0.0 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
27
35
36
37
IN 3/
VISO
“
38
39
2.4 V
40
41
42
43
S1
10 mA
VCTE
“
VCT
“
tON
“
tOFF
“
Test limits
Adapter pin number 1/
0.8 V
IN 4/
IN
IN
IN
IN
-VCC
VL
VR
N.C.
10
Measured pin
number
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
None
“
“
“
“
“
“
“
K6
K7
K6
K7
None
“
“
“
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3
4
3
4
3
4
3
4
3
4
3
4
11
12
11
12
3
4
3
4
1
14
1
14
1
14
6
6
7
7
8
8
9
9
D1
D2
N.C.
IN2
11
12
13
14
6
7
8
9
15.0 V
“
“
“
10.0 V
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-15.0 V
“
“
“
-10.0 V
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
15.0 V
“
15.0 V
-15.0 V
“
-15.0 V
+5.0 V
“
+5.0 V
GND
“
GND
IN 3/
2.4 V
K2
K3
K1
11
12
12
-15.0 V
-15.0 V
+5.0 V
+5.0 V
GND
GND
2.4 V
K1
K1
11
12
dBCT = -20 log ( VOUT / VIN )
15.0 V
IN 4/
15.0 V
dBISO = -20 log ( VOUT / VIN )
15.0 V
IN
“
“
IN
“
-10.0 V
-10.0 V
2.4 V
10.0 V
10.0 V
2.4 V
-7.5 V
2.4 V
-7.5 V
7.5 V
7.5 V
2.4 V
10.0 V
2.4 V
-10.0 V
2.4 V
10.0 V
-10.0 V
10.0 V
10.0 V
0.8 V
-10.0 V
0.8 V
-10.0 V
10.0 V
10.0 V
0.8 V
-10.0 V
0.8 V
-10.0 V
0.0 V
2.4 V
Unit
Subgroup 1
TA = 25°C
Min
Max
Subgroup 2
TA = 125°C
Min
-9.25
-9.25
Max
Subgroup 3
TA = -55°C
Min
-8.50
-8.50
Max
-9.25
-9.25
9.25
9.25
8.50
8.50
9.25
9.25
-6.75
-6.75
6.75
6.75
-2
2
“
“
“
“
“
“
-1
1
“
“
“
“
“
“
-1
1
“
“
“
“
“
“
-1
0
-1
0
0
1
0
1
0
1
0
1
--10
--10
-10
---10
----10
--10
-10
---10
--Subgroup 4
TA = 25°C
Min
Max
--15
--15
-6.0
-6.0
6.0
6.0
-200
200
“
“
“
“
“
“
-100
100
“
“
“
“
“
“
-100
100
“
“
“
“
“
“
-10
0
-10
0
0
10
0
10
0
10
0
10
--100
--100
-100
---100
----100
--100
-100
---100
--Subgroup 7
TA = 25°C
Min
Max
-6.75
-6.75
6.75
6.75
-200
200
“
“
“
“
“
“
-100
100
“
“
“
“
“
“
-100
100
“
“
“
“
“
“
-1
0
-1
0
0
1
0
1
0
1
0
1
--10
--10
-10
---10
----10
--10
-10
---10
--Subgroup 9
TA = 25°C
Min
Max
mV
“
mVPP
dB
3.16
50
3.16
3.16
50
-15.0 V
“
“
“
+5.0 V
“
“
“
GND
“
“
“
OUT
OUT
IN
OUT
IN
OUT
K4
K5
K4
K5
1 to 11
14 to 12
1 to 11
14 to 12
V 2/
“
“
“
“
“
“
“
nA
“
“
“
nA
“
“
“
nA
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
450
450
250
250
mVPP
“
dB
ns
“
ns
“
MIL-M-38510/105A
See footnotes at end of table.
+VCC
Relays
energized
TABLE III. Group A inspection for device type 02. – Continued.
Symbol
Test
Adapter pin number 1/
number
IN1
N.C.
S1
S2
N.C.
1
2
tON
“
44
45
IN
IN
3
4
5
tOFF
“
46
47
IN
IN
tON
“
48
49
IN
tOFF
“
50
51
IN
0.0 V
+VCC
-VCC
VL
VR
N.C.
10
K4
K5
1 to 11
14 to 12
-----
550
550
ns
“
OUT
IN
K4
K5
1 to 11
14 to 12
-----
400
400
“
“
OUT
IN
K4
K5
1 to 11
14 to 12
-----
375
375
“
“
OUT
IN
K4
K5
1 to 11
14 to 12
-----
250
250
“
“
0.0 V
IN2
11
12
13
14
7
8
9
+5.0 V
“
GND
“
OUT
IN
-15.0 V
“
“
“
“
“
“
“
OUT
IN
“
“
“
“
“
“
“
“
“
“
OUT
IN
“
“
“
“
“
“
“
“
OUT
IN
IN
IN
N.C.
6
IN
Measured pin
number
D2
15.0 V
“
Test limits
Relays
energized
D1
OUT
Subgroup 10
TA = 125°C
Min
Max
Subgroup 11
TA = -55°C
Min
Max
Subgroup 12
TA = 25°C
Min
Max
Unit
CA
“
52
53
“
“
“
“
“
“
“
“
None
“
1
14
-----
30
30
pF
“
CIS
“
54
55
“
“
“
“
“
“
“
“
“
“
3
4
-----
20
20
“
“
COS
“
56
57
“
“
“
“
“
“
“
“
“
“
11
12
-----
20
20
“
“
See notes at end of table.
MIL-M-38510/105A
28
TABLE III. Group A inspection for device types 03, 05.
Symbol
RDS
“
“
“
“
“
“
“
ID(ON)
“
“
“
ID(OFF)
“
“
“
IS(OFF)
“
“
“
IIL
IIH
“
+ICC
“
-ICC
“
+IL
“
+IR
“
Test
Adapter pin number 1/
number
IN
IN
N.C.
S1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
1 6/
1 7/
2
3
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.8 V
2.4 V
0.0 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
2.4 V
“
“
“
“
“
“
“
“
“
“
“
0.8 V
“
“
“
“
“
“
“
0.0 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
S2
N.C.
4
5
10 mA
10 mA
-10 mA
-10 mA
10 mA
10 mA
-10 mA
-10 mA
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
+VCC
-VCC
VL
VR
N.C.
D1
10
11
6
7
8
9
15.0 V
“
“
“
10.0 V
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-15.0 V
“
“
“
-10.0 V
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
D2
N.C.
N.C.
12
13
14
-10.0 V
-10.0 V
10.0 V
10.0 V
-7.5 V
-7.5 V
7.5 V
7.5 V
10.0 V
10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
Relays
energized
Measured pin
number
None
“
“
“
“
“
“
“
K7
K6
K7
K6
None
“
“
“
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
4
3
4
3
4
3
4
3
4
3
4
3
11
12
11
12
3
4
3
4
1
1
1
6
6
7
7
8
8
9
9
Test limits
Subgroup 1
TA = 25°C
Min
Max
Subgroup 2
TA = 125°C
Min
-9.25
-9.25
9.25
9.25
8.50
8.50
2
“
“
“
1
“
“
“
1
“
“
“
0
1
1
10
10
----10
10
-----
Min
-8.50
-8.50
-6.75
-6.75
6.75
6.75
-2
“
“
“
-1
“
“
“
-1
“
“
“
-1
0
0
-----10
-10
-----10
-10
Max
Subgroup 3
TA = -55°C
Max
-9.25
-9.25
9.25
9.25
-6.0
-6.0
6.0
6.0
-200
“
“
“
-100
“
“
“
-100
“
“
“
-10
0
0
-----100
-100
-----100
-100
200
“
“
“
100
“
“
“
100
“
“
“
0
10
10
100
100
----100
100
-----
-6.75
-6.75
6.75
6.75
-200
“
“
“
-100
“
“
“
-100
“
“
“
-1
0
0
-----10
-10
-----10
-10
Unit
200
“
“
“
100
“
“
“
100
“
“
“
0
1
1
10
10
----10
10
-----
V 2/
“
“
“
“
“
“
“
nA
“
“
“
nA
“
“
“
nA
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
See footnotes at end of table.
MIL-M-38510/105A
29
TABLE III. Group A inspection for device types 03, 05 – Continued.
Symbol
Test
Adapter pin number 1/
number
IN
N.C.
S1
32
33
34
1
IN 3/
IN 3/
2.4 V
2
VCTE
“
VCT
3
GND
VISO
“
35
36
2.4 V
0.8 V
tON
“
tOFF
“
37
38
39
40
IN
“
IN
“
tON
“
tOFF
“
tON
“
tOFF
“
CA
CIS
“
COS
“
tD 5/
“
tD 5/
“
tD 5/
“
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
IN
“
IN
“
IN
“
IN
“
0.0 V
IN
“
“
“
“
“
S2
N.C.
+VCC
-VCC
VL
VR
N.C.
D1
D2
N.C.
NC
4
5
6
15.0 V
“
7
-15.0 V
“
8
+5.0 V
“
9
GND
“
10
11
12
13
14
-15.0 V
-15.0 V
+5.0 V
+5.0 V
GND
GND
-15.0 V
“
“
“
+5.0 V
“
“
“
GND
“
“
“
GND
IN 4/
IN 4/
IN
IN
dBCT = 20 log ( VOUT / VIN )
15.0 V
IN 4/
15.0 V
dBISO = -20 log ( VOUT / VIN )
15.0 V
IN
“
“
IN
“
IN
IN
IN
IN
IN
IN
IN
IN
IN
“
“
“
“
“
IN
“
“
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
15.0 V
“
“
“
“
“
Relays
energized
Measured pin
number
K2
K3
K1
11
12
12
K1
K1
12
11
K4
K5
K4
K5
11
12
11
12
Subgroup 4
TA = 25°C
Min
Max
--15
--15
Test limits
Subgroup 7
TA = 25°C
Min
Max
Subgroup 9
TA = 25°C
Min
Max
3.16
50
3.16
3.16
50
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
-15.0 V
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
K4
K5
K4
K5
K4
K5
K4
K5
None
“
“
“
“
K4, K8
“
“
“
“
“
11
12
11
12
11
12
11
12
1
3
4
11
12
11
12
11
12
11
12
Subgroup 10
TA = 125°C
Min
Max
--550
--550
--400
--400
Subgroup 11
TA = -55°C
Min
Max
---------
Subgroup 13
TA = 25°C
Min
Max
20
--20
---
375
375
250
250
Subgroup 14
TA = 125°C
Min
Max
20
20
450
450
250
250
Subgroup 12
TA = 25°C
Min
Max
--30
--20
--20
--20
--20
Subgroup 14
TA = -55°C
Min
Max
----20
20
-----
Unit
mV
“
mVPP
dB
mVPP
“
dB
ns
“
“
“
ns
“
“
“
“
“
“
“
pF
“
“
“
“
ns
“
“
“
“
“
See notes at end of table.
MIL-M-38510/105A
30
TABLE III. Group A inspection for device types 04, 06.
Symbol
RDS
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
ID(ON)
“
“
“
“
“
“
“
ID(OFF)
“
“
“
“
“
“
“
IS(OFF)
“
“
“
“
“
“
“
IIL
“
IIH
“
“
“
+ICC
“
-ICC
“
+IL
“
+IR
“
Test
Adapter pin number 1/
number
IN1
IN1
1 8/
1 9/
2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
2.4 V
2.4 V
2.4 V
0.8 V
10.0 mA
S1
S3
S2
S4
3
4
5
10.0 mA
10.0 mA
10.0 mA
2.4 V
2.4 V
2.4 V
0.8 V
-10.0 mA
-10.0 mA
-10.0 mA
-10.0 mA
2.4 V
2.4 V
2.4 V
0.8 V
10.0 mA
10.0 mA
10.0 mA
10.0 mA
2.4 V
2.4 V
2.4 V
0.8 V
-10.0 mA
-10.0 mA
-10.0 mA
-10.0 mA
2.4 V
2.4 V
2.4 V
0.8 V
10.0 V
10.0 V
10.0 V
10.0 V
2.4 V
2.4 V
2.4 V
0.8 V
-10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
10.0 V
10.0 V
10.0 V
10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
10.0 V
10.0 V
10.0 V
10.0 V
0.0 V
0.0 V
2.4 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
+VCC
-VCC
VL
VR
D1
6
7
8
9
10
15.0 V
“
“
“
“
“
“
“
10.0 V
“
“
“
“
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-15.0 V
“
“
“
“
“
“
“
-10.0 V
“
“
“
“
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-10.0 V
D3
D2
D4
IN2
IN2
11
12
13
14 8/
14 9/
-10.0 V
-10.0 V
-10.0 V
2.4 V
2.4 V
2.4 V
0.8 V
10.0 V
2.4 V
2.4 V
2.4 V
0.8 V
-7.5 V
2.4 V
2.4 V
2.4 V
0.8 V
7.5 V
2.4 V
2.4 V
2.4 V
0.8 V
10.0 V
2.4 V
2.4 V
2.4 V
0.8 V
-10.0 V
2.4 V
2.4 V
2.4 V
0.8 V
10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
-10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
-10.0 V
0.8 V
0.8 V
0.8 V
2.4 V
0.0 V
0.0 V
2.4 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
10.0 V
10.0 V
10.0 V
-7.5 V
-7.5 V
-7.5 V
7.5 V
7.5 V
7.5 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
Relays
energized
Measured
pin
number
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
K10
K11
K12
K13
K10
K11
K12
K13
None
“
“
“
“
“
“
“
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
2
3
4
5
2
3
4
5
2
3
4
5
2
3
4
5
2
3
4
5
2
3
4
5
10
11
12
13
10
11
12
13
2
3
4
5
2
3
4
5
1
14
1
14
1
14
6
6
7
7
8
8
9
9
Test limits
Subgroup 1
TA = 25°C
Min
Max
Subgroup 2
TA = 125°C
Min
-9.25
-9.25
-9.25
-9.25
9.25
9.25
9.25
9.25
8.50
8.50
8.50
8.50
2
“
“
“
“
“
“
“
1
“
“
“
“
“
“
“
1
“
“
“
“
“
“
“
0
0
1
1
1
1
10
10
----10
10
-----
Min
-8.50
-8.50
-8.50
-8.50
-6.75
-6.75
-6.75
-6.75
6.75
6.75
6.75
6.75
-2
“
“
“
“
“
“
“
-1
“
“
“
“
“
“
“
-1
“
“
“
“
“
“
“
-1
-1
0
0
0
0
-----10
-10
-----10
-10
Max
Subgroup 3
TA = -55°C
6.0
6.0
6.0
6.0
-200
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-10
-10
0
0
0
0
-----100
-100
-----100
-100
Max
-9.25
-9.25
-9.25
-9.25
9.25
9.25
9.25
9.25
-6.0
-6.0
-6.0
-6.0
200
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
0
0
10
10
10
10
100
100
----100
100
-----
-6.75
-6.75
-6.75
-6.75
6.75
6.75
6.75
6.75
-200
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-1
-1
0
0
0
0
-----10
-10
-----10
-10
Unit
200
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
0
0
1
1
1
1
10
10
----10
10
-----
V 2/
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
nA
“
“
“
“
“
“
“
nA
“
“
“
“
“
“
“
nA
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
See footnotes at end of table.
MIL-M-38510/105A
31
TABLE III. Group A inspection for device types 04, 06 – Continued.
Symbol
VCTE
“
“
“
Test
Adapter pin number 1/
number
IN1
1
2
55
56
57
58
IN 3/
IN 3/
GND
59
60
2.4 V
VISO
“
“
“
“
61
62
63
64
0.8 V
0.8 V
tON
“
“
“
tOFF
“
“
“
tON
“
“
“
tOFF
“
“
“
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
IN
IN
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
S3
S2
S4
3
4
5
6
7
GND
15.0 V
“
“
“
-15.0 V
“
“
“
GND
GND
VCT
“
“
tON
“
“
“
tOFF
“
“
“
CA
“
CIS
“
“
“
COS
“
“
“
tD 5/
“
“
“
S1
IN 4/
IN 4/
IN 4/
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
15.0 V
IN 4/
“
dBCT = -20 log ( VOUT / VIN )
15.0 V
“
IN 4/
“
IN 4/
“
dBISO = -20 log ( VOUT / VIN )
15.0 V
“
IN
“
IN
“
15.0 V
“
IN
“
IN
“
15.0 V
“
IN
“
IN
“
15.0 V
“
IN
“
IN
“
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
0.0 V
IN
IN
IN
IN
IN
IN
IN
IN
15.0 V
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-VCC
VR
D1
D3
D2
D4
IN2
8
9
10
11
12
13
14
+5.0 V
“
“
“
GND
“
“
“
VL
IN 3/
IN 3/
Relays
energized
Measured
pin
number
K2
K4
K5
K3
10
11
12
13
-15.0 V
“
+5.0 V
“
GND
“
2.4 V
K1
K1
12
10
-15.0 V
“
“
“
+5.0 V
“
“
“
GND
“
“
“
0.8 V
0.8 V
K1
K1
K1
K1
10
11
12
13
-15.0 V
“
“
“
-15.0 V
“
“
“
-15.0 V
“
“
“
-15.0 V
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
GND
“
“
“
GND
“
“
“
GND
“
“
“
GND
“
“
“
K6
K8
K9
K7
K6
K8
K9
K7
K6
K8
K9
K7
K6
K8
K9
K7
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
-15.0 V
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
OUT
OUT
OUT
OUT
IN
IN
OUT
IN
IN
OUT
IN
IN
OUT
IN
IN
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
IN
IN
OUT
IN
IN
OUT
OUT
OUT
0.0 V
IN
IN
K6
K8
K9
K7
K6
K8
K9
K7
None
“
“
“
“
“
“
“
“
“
K6, K14
K6, K14
K7, K15
K7, K15
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
1
14
2
3
4
5
10
11
12
13
10
11
12
13
Test limits
Unit
Subgroup 4
TA = 25°C
Min
Max
15
“
“
“
Subgroup 7
TA = 25°C
Min
Max
3.16
3.16
50
3.16
3.16
3.16
3.16
50
mV
“
“
“
Subgroup 9
TA = 25°C
Min
Max
Subgroup 10
TA = 125°C
Min
Max
mVPP
“
dB
450
450
450
450
250
250
250
250
Subgroup 11
TA = -55°C
Min
Max
--375
--375
--375
--375
--250
--250
--250
--250
Subgroup 12
TA = 25°C
Min
Max
---------------------
550
550
550
550
400
400
400
400
Subgroup 13
TA = 125°C
Min
Max
30
30
20
20
20
20
20
20
20
20
20
20
20
20
---------
mVPP
“
“
“
dB
ns
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
pF
“
“
“
“
“
“
“
“
“
ns
“
“
“
32
MIL-M-38510/105A
See footnotes at end of table.
IN
IN
+VCC
TABLE III. Group A inspection for device types 04, 06 – Continued.
Symbol
Test
number
tD 5/
“
“
“
tD 5/
“
“
“
103
104
105
106
107
108
109
110
Adapter pin number 1/
IN1
S1
S3
S2
S4
+VCC
-VCC
VL
VR
D1
D3
D2
D4
IN2
1
IN
IN
2
IN
IN
3
IN
IN
4
5
6
15.0 V
“
“
“
“
“
“
“
7
-15.0 V
“
“
“
“
“
“
“
8
+5.0 V
“
“
“
“
“
“
“
9
GND
“
“
“
“
“
“
“
10
11
12
13
14
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
Relays
Measured
energized
pin
K6, K14
K6, K14
K7, K15
K7, K15
K6, K14
K6, K14
K7, K15
K7, K15
number
10
11
12
13
10
11
12
13
Subgroup 14
TA = 125°C
Min
Max
20
--20
--20
--20
---
Test limits
Subgroup 14
TA = -55°C
Min
Max
20
20
20
20
---------
Unit
ns
“
“
“
“
“
“
“
See footnotes at end of table.
Mil-M-38510/105A
33
TABLE III. Group A inspection for device type 07, 08.
Symbol
Test
number
RDS
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
ID(ON)
“
“
“
“
“
“
“
ID(OFF)
“
“
“
“
“
“
“
IS(OFF)
“
“
“
“
“
“
“
IIL
IIH
“
+ICC
“
-ICC
“
+IL
“
+IR
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
Adapter pin number 1/
IN
IN
1 10/
2.4 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
0.8 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
0.0 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
S1
S3
S2
S4
1 11/
2
3
4
5
6
7
8
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
2.4 V
0.8 V
0.8 V
2.4 V
0.0 V
2.4 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
10.0 mA
10.0 mA
15.0 V
“
“
“
-15.0 V
“
“
“
“
“
“
10.0 V
“
“
“
“
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-10.0 V
“
“
“
“
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
10.0 mA
-VCC
-10.0 mA
-10.0 mA
-10.0 mA
-10.0 mA
10.0 mA
10.0 mA
10.0 mA
10.0 mA
-10.0 mA
-10.0 mA
-10.0 mA
-10.0 mA
10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
10.0 V
VL
D1
D3
D2
D4
N.C.
9
10
11
12
13
14
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-10.0 V
VR
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
10.0 V
-7.5 V
-7.5 V
-7.5 V
-7.5 V
7.5 V
7.5 V
7.5 V
7.5 V
10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
10.0 V
10.0 V
10.0 V
10.0 V
-10.0 V
-10.0 V
-10.0 V
-10.0 V
Relays
Measured
energized
pin
number
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
K10
K11
K12
K13
K10
K11
K12
K13
None
“
“
“
“
“
“
“
None
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
2
3
4
5
2
3
4
5
2
3
4
5
2
3
4
5
2
3
4
5
2
3
4
5
10
11
12
13
10
11
12
13
2
3
4
5
2
3
4
5
1
1
1
6
6
7
7
8
8
9
9
Test limits
Subgroup 1
TA = 25°C
Min
Max
Subgroup 2
TA = 125°C
Min
-9.25
-9.25
-9.25
-9.25
9.25
9.25
9.25
9.25
8.50
8.50
8.50
8.50
2
“
“
“
“
“
“
“
1
“
“
“
“
“
“
“
1
“
“
“
“
“
“
“
0
1
1
10
10
----10
10
-----
Min
-8.50
-8.50
-8.50
-8.50
-6.75
-6.75
-6.75
-6.75
6.75
6.75
6.75
6.75
-2
“
“
“
“
“
“
“
-1
“
“
“
“
“
“
“
-1
“
“
“
“
“
“
“
-1
0
0
-----10
-10
-----10
-10
Max
Subgroup 3
TA = -55°C
6.0
6.0
6.0
6.0
-200
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-10
0
0
-----100
-100
-----100
-100
Max
-9.25
-9.25
-9.25
-9.25
9.25
9.25
9.25
9.25
-6.0
-6.0
-6.0
-6.0
200
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
0
10
10
100
100
----100
100
-----
-6.75
-6.75
-6.75
-6.75
6.75
6.75
6.75
6.75
-200
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-100
“
“
“
“
“
“
“
-1
0
0
-----10
-10
-----10
-10
Unit
200
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
0
1
1
10
10
----10
10
-----
V 2/
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
nA
“
“
“
“
“
“
“
nA
“
“
“
“
“
“
“
nA
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
34
MIL-M-38510/105A
See footnotes at end of table.
10.0 mA
+VCC
TABLE III. Group A inspection for device types 07, 08 – Continued.
Symbol
Test
number
VCTE
“
“
“
52
53
54
55
Adapter pin number 1/
IN1
S1
S3
S2
S4
1
2
3
4
5
IN
IN
IN
IN
3/
3/
3/
3/
VCT
56
2.4 V
“
57
58
59
60
61
2.4 V
0.8 V
0.8 V
0.8 V
0.8 V
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
VISO
“
“
“
“
tON
“
“
“
tOFF
“
“
“
tON
“
“
“
tOFF
“
“
“
tON
“
“
“
tOFF
“
“
“
CA
CIS
“
“
“
COS
“
“
“
tD 5/
“
“
“
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
IN 4/
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
0.0 V
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
VL
VR
D1
D3
D2
D4
NC
10
11
12
13
14
6
7
8
9
15.0 V
“
“
“
-15.0 V
“
“
“
+5.0 V
“
“
“
GND
“
“
“
15.0 V
dBCT = -20 log ( VOUT / VIN )
IN 4/
15.0 V
15.0 V
“
“
“
dBISO = -20 log ( VOUT / VIN )
15.0 V
“
IN
“
IN
“
15.0 V
“
IN
“
IN
“
15.0 V
“
IN
“
IN
“
15.0 V
“
IN
“
IN
“
IN
-VCC
15.0 V
“
“
“
15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Relays
energized
Measured
pin
number
K2
K4
K5
K3
10
11
12
13
-15.0 V
+5.0 V
GND
K1
12
-15.0 V
-15.0 V
“
“
“
+5.0 V
+5.0 V
“
“
“
GND
GND
“
“
“
K1
K1
K1
K1
K1
10
10
11
12
13
-15.0 V
“
“
“
-15.0 V
“
“
“
-15.0 V
“
“
“
-15.0 V
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
GND
“
“
“
GND
“
“
“
GND
“
“
“
GND
“
“
“
K6
K8
K9
K7
K6
K8
K9
K7
K6
K8
K9
K7
K6
K8
K9
K7
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
-15.0 V
“
“
“
-15.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
+5.0 V
“
“
“
+5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
K6
K8
K9
K7
K6
K8
K9
K7
None
“
“
“
“
“
“
“
“
K6, K14
K6, K14
K7, K15
K7, K15
2 to 10
3 to 11
4 to 12
5 to 13
2 to 10
3 to 11
4 to 12
5 to 13
1
2
3
4
5
10
11
12
13
10
11
12
13
Test limits
Unit
Subgroup 4
TA = 25°C
Min
Max
15
“
“
“
Subgroup 7
TA = 25°C
Min
Max
3.16
50
3.16
3.16
3.16
3.16
3.16
50
mV
“
“
“
Subgroup 9
TA = 25°C
Min
Max
3.16
Subgroup 10
TA = 125°C
Min
Max
450
450
450
450
250
250
250
250
Subgroup 11
TA = -55°C
Min
Max
--375
--375
--375
--375
--250
--250
--250
--250
Subgroup 12
TA = 25°C
Min
Max
-------------------
550
550
550
550
400
400
400
400
Subgroup 13
TA = 25°C
Min
Max
30
20
20
20
20
20
20
20
20
20
20
20
20
---------
mVPP
dB
mVPP
mVPP
“
“
“
dB
ns
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
pF
“
“
“
“
“
“
“
“
ns
“
“
“
35
MIL-M-38510/105A
See footnotes at end of table.
+VCC
TABLE III. Group A inspection for device types 07, 08 – Continued.
Symbol
tD 5/
“
“
“
tD 5/
“
“
“
Test
Adapter pin number 1/
number
IN1
S1
S3
S2
S4
+VCC
-VCC
VL
VR
D1
D3
D2
D4
IN2
1
IN
IN
IN
IN
IN
IN
IN
IN
2
IN
IN
3
IN
IN
4
5
6
15.0 V
“
“
“
“
“
“
“
7
-15.0 V
“
“
“
“
“
“
“
8
+5.0 V
“
“
“
“
“
“
“
9
GND
“
“
“
“
“
“
“
10
11
12
13
14
99
100
101
102
103
104
105
106
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
Relays
Measured
energized
pin
K6, K14
K6, K14
K7, K15
K7, K15
K6, K14
K6, K14
K7, K15
K7, K15
number
10
11
12
13
10
11
12
13
Subgroup 14
TA = 125°C
Min
Max
20
--20
--20
--20
---
Test limits
Subgroup 14
TA = -55°C
Min
Max
20
20
20
20
---------
Unit
ns
“
“
“
“
“
“
“
1/ The test circuits used with table III are shown in figure 13, 14, 15, 16, and 17. The waveforms of figure 8 apply to all device types as specified in table III (see tests
for tON and tOFF ). The waveforms of figure 12 apply to devices 03, 04, and 07 only as specified in table III.
36
3/ The input pulse generator shall have the following characteristics: VGEN = 0-3 V for all device types: rise time / fall time ≤ 10 ns;
PRR = 1 kHz at 50 percent duty cycle.
4/ The input generator shall have the following characteristics: VGEN = 1 VPP at 1 MHz.
5/ Break-before-make test applies to devices 03, 04, and 07 only.
6/ Conditions for device type 03 only.
7/ Conditions for device type 05 only.
8/ Conditions for device type 06 only.
9/ Conditions for device type 04 only.
10/ Conditions for device type 08 only.
11/ Conditions for device type 07 only.
MIL-M-38510/105A
2/ RDS may be measured differentially with respect to VA. In case of differentially measured voltages, the table III limits representing voltage drop across the tested
switch must be maintained.
MIL-M-38510/105A
Table IV. Groups C end point electrical parameters. (TA = 25°C, ±VCC = ±15 V).
Device types 01 - 08
Test
Limits
Min
Max
Delta
RDS
+9.25 V
-9.25 V
50 mV
RDS
-10.00 V
+10.00 V
50 mV
IS(OFF)
-1 nA
+1 nA
±0.5 nA
ID(OFF)
-1 nA
+1 nA
±0.5 nA
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or
order (see 6.2). When packaging of materiel is to be performed by DoD personnel, these personnel need to contact the
responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the
Inventory Control Point’s packaging activity within the Military Department of Defense Agency, or within the Military
Department’s System Command. Packaging data retrieval is available from the managing Military Department’s or Defense
Agency’s automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature which may be helpful, but is not mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
PIN and compliance identifier, if applicable (1.2).
c.
Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to acquiring activity in addition to
notification of the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of MIL-STD-883, method 5003),
corrective action and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not
affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by
or direct shipment to the Government.
i.
Requirements for “JAN” marking.
j.
Packaging requirements (see 5.1).
37
MIL-M-38510/105A
6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time
of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have
actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are
urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that
they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information
pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in
this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this
specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid
adversely impacting existing government logistics systems and contractor's parts lists.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535, MIL-HDBK-1331, and as follows:.
+VCC .......................................
-VCC .......................................
+ICC .......................................
-ICC .......................................
VL
.......................................
.......................................
IL
RDS .......................................
.......................................
VD
.......................................
VS
ID(ON) .......................................
ID(OFF) .....................................
IS(OFF) .....................................
tON .......................................
tOFF .......................................
VCTE .......................................
VCT .......................................
VISO .......................................
Positive supply voltage.
Negative supply voltage.
Positive supply current.
Negative supply current.
Logic supply voltage.
Logic supply current.
Resistance of an “ON” switch.
Drain voltage.
Source voltage.
Leakage current from an “ON” driver into the switch.
Leakage current into the drain terminal of an “OFF” switch.
Leakage current into the source terminal of an “OFF” switch.
Switching time as defined in figure 8.
Switching time as defined in figure 8.
Charge transfer error.
Crosstalk between switches.
Isolation from source to drain of a closed switch.
6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified, microcircuits
acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4).
Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered
by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have
equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M38510 device types and may have slight physical variations in relation to case size. The presence of this information should not
be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of
MIL-PRF-38535.
Military device type
01
02
03
04
05
06
07
08
Generic-industry type
5040
5041
5042
5043
5044
5045
5046
5047
38
MIL-M-38510/105A
6.8 Changes from previous issue. Marginal notations is revision to identify changes with respect to the previous issue, due to
the extensiveness of the changes.
Custodians:
Army – CR
Navy - EC
Air Force - 11
NASA – NA
DLA – CC
Preparing activity:
DLA - CC
Project 5962-2005-056
Review activities:
Army – MI, SM
Navy – AS, CG, MC, SH, TD
Air Force – 03, 19, 99
NOTE: The activities listed above were interested in this document as of the date of this document.
Since organizations and responsibilities can change, you should verify the currency of the information above
using the ASSIST Online database at http://assist.daps.dla.mil.
39
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