datasheet for 54164/BCA by Rochester Electronics

datasheet for 54164/BCA by Rochester Electronics
MIL-M-38510/9E
8 February 2005_
SUPERSEDING
MIL-M-38510/9D
4 June 1980
MIL-M-0038510/9B
15 October 1973
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, BIPOLAR TTL, SHIFT REGISTERS, MONOLITHIC SILICON
Inactive for new design after 7 September 1995.
This specification is approved for use by all Departments and Agencies of the Department of Defense.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, shift register
microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each
type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been
superseded by MIL-PRF-38535, (see 6.4).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535 and as specified herein.
1.2.1 Device types. The device types are as follows:
Device type
01
02
03
04
05
06
Circuit
4 bit right shift, left shift register
5 bit shift register
8 bit parallel out serial shift register
8 bit parallel load shift register
4 bit bidirectional shift register
4 bit parallel access shift register
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
A
B
C
D
E
F
GDFP5-F14 or CDFP6-F14
GDFP4-14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
14
14
14
14
16
16
Flat pack
Flat pack
Dual-in-line
Flat pack
Dual-in-line
Flat-pack
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to
[email protected] Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at http://assist.daps.dla.mil.
AMSC N/A
FSC 5962
MIL-M-38510/9E
1.3 Absolute maximum ratings.
Supply voltage range (VCC) .......................................................
Input voltage range ....................................................................
Storage temperature range .......................................................
Maximum power dissipation per register, PD 1/
Device type 01 ....................................................................
Device type 02 ....................................................................
Device type 03 ....................................................................
Device type 04 ....................................................................
Device type 05 ....................................................................
Device type 06 ....................................................................
Lead temperature (soldering 10 seconds) .................................
Thermal resistance, junction-to-case (θJC).................................
Junction temperature (TJ ) 2/ .....................................................
-0.5 V dc to +7.0 V dc
-1.5 V dc at -12 mA to +5.5 V dc
-65°C to +150°C
422 mW dc
400 mW dc
322 mW dc
372 mW dc
360 mW dc
372 mW dc
300°C
(See MIL-STD-1835)
175°C
1.4 Recommended operating conditions.
Supply voltage (VCC) ..................................................................
Minimum high level input voltage ..............................................
Maximum low level input voltage ...............................................
Case operating temperature range (TC ) ....................................
Fan out
Device types 01, 02, 04, 05, and 06
High logic level ............................................................
Low logic level .............................................................
Device type 03
High logic level ............................................................
Low logic level .............................................................
Device type 01
Low level setup time at mode control
with respect to clock 1 input ........................................
High level setup time at mode control
with respect to clock 2 input ........................................
Low level setup time at mode control
with respect to clock 2 input ........................................
High level setup time at mode control
with respect to clock 1 input ........................................
Width of clock pulse ...........................................................
Setup time required at serial A, B, C, D inputs ...................
Hold time required at serial A, B, C, D inputs .....................
Device type 02
Minimum clock pulse width .................................................
Minimum clear pulse width .................................................
Minimum preset pulse width ...............................................
Serial input setup time ........................................................
Serial input hold time ..........................................................
Device type 03
Minimum clock pulse width .................................................
Minimum clear pulse width .................................................
Serial setup time ................................................................
Serial hold time ..................................................................
4.5 V dc minimum to 5.5 V dc maximum
2.0 V dc
0.8 V dc
-55°C to 125°C
20
10
10
5
35 ns minimum
35 ns minimum
10 ns minimum
10 ns minimum
20 ns minimum
20 ns minimum
5 ns minimum
35 ns maximum
30 ns maximum
30 ns maximum
30 ns minimum
0 ns minimum
30 ns maximum
50 ns maximum
15 ns minimum
10 ns maximum
_______
1/ Must withstand the added PD due to short circuit condition (e.g. IOS) at one output for 5 seconds duration.
2/ Maximum junction temperature should not be exceeded except in accordance with allowable short
duration burn-in screening condition in accordance with MIL-PRF-38535.
2
MIL-M-38510/9E
Device type 04
Width of clock input pulse ...................................................
Width of load input pulse ....................................................
Clock enable setup time .....................................................
Parallel input setup time .....................................................
Serial input setup time ........................................................
Shift setup time ..................................................................
Hold time at serial input ......................................................
Hold time at parallel input ..................................................
Device type 05
Width of clock input pulse ...................................................
Width of clear input pulse ...................................................
Data input setup time .........................................................
Clear input setup time ........................................................
Hold time at any input .........................................................
Mode control setup time ....................................................
Device type 06
Width of clock input pulse ...................................................
Width of clear input pulse ...................................................
Shift load input setup time ..................................................
Data input setup time .........................................................
Clear input setup time ........................................................
Shift load release time ........................................................
Data hold time ....................................................................
20 ns minimum
25 ns minimum
30 ns minimum
10 ns minimum
35 ns minimum
45 ns minimum
0 ns maximum
25 ns maximum
20 ns minimum
20 ns minimum
20 ns minimum
25 ns minimum
7 ns minimum
30 ns minimum
16 ns minimum
12 ns minimum
32 ns minimum
25 ns minimum
25 ns minimum
10 ns maximum
0 ns minimum
2.0 APPLICABLE DOCUMENT
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification.
This section does not include documents cited in other sections of this specification or recommended for
additional information or as examples. While every effort has been made to ensure the completeness of this
list, document users are cautioned that they must meet all specified requirements of documents cited in
sections 3, 4, or 5 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications and standards. The following specifications and standards form a part of this specification to
the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
-
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outlines
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
3
MIL-M-38510/9E
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.3).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be
as specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Truth tables and timing diagrams. The truth tables and timing diagrams shall be as specified on figure 2.
3.3.3 Logic diagrams. The logic diagrams shall be as specified on figure 3.
3.3.4 Schematic circuit. The schematic circuit shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity upon request.
3.3.5 Case outlines. Case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table 1
and apply over the full recommended case operating temperature range, unless otherwise specified.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 5 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535
or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall
not effect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior
to qualification and conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
4
MIL-M-38510/9E
TABLE I. Electrical performance characteristics.
Conditions
Test
High-level
output voltage
Symbol
VOH
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VCC = 4.5 V, VIN = 2.0 V,
Min
02, 03
2.4
V
01, 04
05, 06
2.4
V
Max
Unit
IOH = -400 µA
VCC = 4.5 V, VIN = 2.0 V,
IOH = -800 µA
Low-level
output voltage
Limits
Device
type
VOL
VCC = 4.5 V, IOL = 16 mA,
VIN = 0.8 V
01, 02, 04
05, 06
0.4
V
VCC = 4.5 V, VIN = 0.8 V,
IOL = 8 mA
03
0.4
V
High level input voltage
VIH
VCC = 4.5 V
All
2.0
V
Low level input voltage
VIL
VCC = 4.5 V
All
0.8
V
Input clamp voltage
VIC
VCC = 4.5 V, IIN = -12 mA,
All
-1.5
V
High level input current
IIH1
VCC = 5.5 V, VIN = 2.4 V
01
40
µA
IIH2
VCC = 5.5 V, VIN = 5.5 V
01
100
µA
IIH3
VCC = 5.5 V, VIN = 2.4 V
01
80
µA
IIH4
VCC = 5.5 V, VIN = 5.5 V
01
200
µA
IIH1
VCC = 5.5 V, VIN = 2.4 V
02
40
µA
IIH2
VCC = 5.5 V, VIN = 5.5 V
02
100
µA
IIH3
VCC = 5.5 V, VIN = 2.4 V
02
200
µA
µA
TC = 25° C
at any input except
mode control
High level input current
at mode control
High level input current
at any input except
preset
High level input current
at preset
IIH4
VCC = 5.5 V, VIN = 5.5 V
02
500
IIH1
VCC = 5.5 V, VIN = 2.4 V
03
40
µA
IIH2
VCC = 5.5 V, VIN = 5.5 V
03
100
µA
IIH3
VCC = 5.5 V, VIN = 2.4 V
03
80
µA
IIH4
VCC = 5.5 V, VIN = 5.5 V
03
200
µA
High level input current
IIH1
VCC = 5.5 V, VIN = 2.4 V
04
40
µA
other than load input
IIH2
VCC = 5.5 V, VIN = 5.5 V
04
100
µA
High level input current
IIH3
VCC = 5.5 V, VIN = 2.4 V
04
120
µA
High level input current
at any input except
clear
High level input current
at clear
load input
High level input current
Low level input current
at any input except
mode control
IIH4
VCC = 5.5 V, VIN = 5.5 V
04
300
µA
IIH1
VCC = 5.5 V, VIN = 2.4 V
05, 06
40
µA
IIH2
VCC = 5.5 V, VIN = 5.5 V
05, 06
100
µA
IIL1
VCC = 5.5 V, VIN = 0.4 V
01
-1.6
mA
See footnotes at end of table.
5
-0.4
MIL-M-38510/9E
TABLE I. Electrical performance characteristics - Continued.
Conditions
Test
Symbol
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Device
type
Limits
Low level input current
at mode control
IIL2
VCC = 5.5 V, VIN = 0.4 V
01
-0.8
-3.2
mA
Low level input current
at any input except
preset
IIL1
VCC = 5.5 V, VIN = 0.4 V
02
-0.7
-1.6
mA
Low level input current
at preset
IIL2
VCC = 5.5 V, VIN = 0.4 V
02
-3.0
-8.0
mA
Low level input current
at any input except
clear
IIL1
VCC = 5.5 V, VIN = 0.4 V
03
-0.4
-1.6
mA
Low level input current
at clear
IIL2
VCC = 5.5 V, VIN = 0.4 V
03
-0.7
-2.6
mA
Low level input current
load input
IIL1
VCC = 5.5 V, VIN = 0.4 V
04
-1.2
-3.9
mA
Low level input current
other than clock and
load input
IIL2
VCC = 5.5 V, VIN = 0.4 V
04
-0.4
-1.3
mA
Low level input current
clock input
IIL3
VCC = 5.5 V, VIN = 0.4 V
04
-0.4
-1.6
mA
Low level input current
other than S0, S1 and
clock input
IIL1
VCC = 5.5 V, VIN = 0.4 V
05
-0.4
-1.3
mA
Low level input current
S0 and S1 input
IIL2
VCC = 5.5 V, VIN = 0.4 V
05
-0.4
-1.6
mA
Low level input current
clock input
IIL3
VCC = 5.5 V, VIN = 0.4 V
05
-0.7
-1.6
mA
Low level input current
at clear input
IIL1
VCC = 5.5 V, VIN = 0.4 V
06
-0.4
-1.3
mA
Low level input current
other than clear and
clock inputs
IIL2
VCC = 5.5 V, VIN = 0.4 V
06
-0.4
-1.6
mA
Low level input current
at clock input
IIL3
VCC = 5.5 V, VIN = 0.4 V
06
-0.7
-1.6
mA
Short-circuit output
IOS
VCC = 5.5 V
mA
1/
current
See footnotes at end of table.
6
01
-18
-57
02, 05, 06
-20
-57
03
-10
-27.5
04
-20
-55
MIL-M-38510/9E
TABLE I. Electrical performance characteristics - Continued.
Conditions
Test
Supply current
Supply current
Symbol
ICC
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VCC = 5.5 V
2/
Device
type
Limits
01
72
02
68
04, 05, 06
63
mA
ICC1
VCC = 5.5 V, VIN(CLOCK) = 0.4 V
2/
03
44
mA
ICC2
VCC = 5.5 V, VIN(CLOCK) = 2.4 V
2/
03
54
mA
Maximum shift frequency
fMAX
VCC = 5.0 V, CL = 50 pF ±10%
01
Propagation delay time,
low to high level from clock 1
or clock 2 to outputs
tPLH
Propagation delay time,
high to low level from clock 1
or clock 2 to outputs
tPHL
Maximum clock frequency
fMAX
16
MHz
RL = 400 Ω ±5%
(See figure 4)
VCC = 5.0 V, CL = 50 pF ±10%
02
10
42
ns
10
49
ns
7
MHz
RL = 400 Ω ±5%
Propagation delay time,
low to high level from clock
to output
tPLH1
Propagation delay time,
high to low level from clock
to output
(See figure 5)
8
56
ns
tPHL1
8
56
ns
Propagation delay time,
low to high level from preset
to output
tPLH2
8
59
ns
Propagation delay time,
high to low level from clear
to output
tPHL3
8
77
ns
Maximum clock frequency
fMAX
Propagation delay time,
high to low level, clear input
to Q outputs
tPHL1
Propagation delay time,
high to low level, clock input
to Q outputs
Propagation delay time,
low to high level, clock input
to Q outputs
VCC = 5.0 V, CL = 50 pF ±10%
03
18
MHz
RL = 800 Ω ±5%
(See figure 6)
12
63
ns
tPHL2
10
52
ns
tPLH2
10
42
ns
See footnotes at end of table.
7
MIL-M-38510/9E
TABLE I. Electrical performance characteristics - Continued.
Conditions
Test
Symbol
Maximum clock frequency
fMAX
Propagation delay time,
low to high level, load input
to any output
tPLH1
Propagation delay time,
high to low level, load input
to any output
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VCC = 5.0 V, CL = 50 pF ±10%
Device
type
04
Limits
14
MHz
RL = 400 Ω ±5%
(See figure 7)
10
40
ns
tPHL1
11
60
ns
Propagation delay time,
low to high level, clock input
to any output
tPLH2
6
37
ns
Propagation delay time,
high to low level, clock input
to any output
tPHL2
10
47
ns
Propagation delay time,
low to high level, H input
to QH output
tPLH3
5
27
ns
Propagation delay time,
high to low level, H input
to QH output
tPHL3
11
54
ns
Propagation delay time,
low to high level, H input
tPLH4
10
41
ns
tPHL4
10
41
ns
to Q H output
Propagation delay time,
high to low level, H input
to Q H output
Maximum clock frequency
fMAX
Propagation delay time,
high to low level, output
from clear
tPHL1
Propagation delay time,
low to high level output
from clock
Propagation delay time,
high to low level output
from clock
VCC = 5.0 V, CL = 50 pF ±10%
05
18
MHz
RL = 400 Ω ±5%
(See figure 8)
7
48
ns
tPLH2
7
36
ns
tPHL2
7
44
ns
See footnotes at end of table.
8
MIL-M-38510/9E
TABLE I. Electrical performance characteristics - Continued.
Conditions
Test
Symbol
Maximum clock frequency
fMAX
Propagation delay time,
high to low level output
from clear
tPHL1
Propagation delay time,
high to low level output
from clock
Propagation delay time,
low to high level output
from clock
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VCC = 5.0 V, CL = 50 pF ±10%
Device
type
06
Limits
24
MHz
RL = 400 Ω ±5%
(See figure 9)
7
34
ns
tPLH2
7
28
ns
tPHL2
7
34
ns
1/ Not more than one output should be shorted at a time.
2/ Device type:
01 - With the outputs open, mode control at 4.5 V, clock pulse applied to both clock inputs, ICC is measured
immediately after the application of the clock pulse.
02 - With the outputs open, presets at 4.5 V, ICC is measured with the clock at ground and again with the
clock at 4.5 V.
03 - ICC is measured with outputs open, serial inputs grounded, and a momentary ground, then 4.5 V
applied to clear.
04 - With the outputs open, serial at ground, clock, clock inhibit, and parallel inputs at 4.5 V, ICC is
measured by applying momentary ground, then 4.5 V to shift load prior to measurement.
05 - With all outputs open, inputs A thru D grounded, 5.5. V applied to S0, S1, clear, and the serial inputs,
ICC is tested by applying clock pulse.
06 - With the outputs open, clear at 5.5 V, shift load, J, K , and data inputs grounded, ICC is measured by
applying clock pulse.
9
MIL-M-38510/9E
TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535
Test requirement
Interim electrical parameters
Class S
Devices
Class B
Devices
1
1
Final electrical test parameters
1*, 2, 3, 7,
9, 10, 11
1*, 2, 3,
7, 9
Group A test requirements
1, 2, 3, 7, 8,
9, 10, 11
Group B electrical test parameters
when using the method 5005 QCI option
1, 2, 3, 7, 8,
9, 10, 11
Group C end point electrical parameters
1, 2, 3, 7, 8,
9, 10, 11
1, 2, 3
Group D end point electrical parameters
1, 2, 3
1, 2, 3
1, 2, 3, 7, 8
9, 10, 11
1, 2, 3
7, 9
*PDA applies to subgroup 1 (see 4.3c.).
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5 and 6 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB)
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given
are conventional current and positive when flowing into the referenced terminal.
10
MIL-M-38510/9E
Figure 1. Terminal connections.
11
MIL-M-38510/9E
Figure 1. Terminal connections - Continued.
12
MIL-M-38510/9E
Device type 01
INPUTS
MODE
CLOCKS
CONTROL 2 (L)
OUTPUTS
SERIAL
PARALLEL
1(R)
A
B
C
D
QA
QB
QC
QD
H
H
X
X
X
X
X
X
QA0
QB0
QC0
QD0
H
↓
X
X
a
b
c
d
a
b
c
d
H
↓
X
X
QB†
QC†
QD†
d
QBn
QCn
QDn
d
L
L
H
X
X
X
X
X
QA0
QB0
QC0
QD0
L
X
↓
H
X
X
X
X
H
QAn
QBn
QCn
L
X
↓
L
X
X
X
X
L
QAn
QBn
QCn
↑
L
L
X
X
X
X
X
QA0
QB0
QC0
QD0
↓
L
L
X
X
X
X
X
QA0
QB0
QC0
QD0
↓
L
H
X
X
X
X
X
QA0
QB0
QC0
QD0
↑
H
L
X
X
X
X
X
QA0
QB0
QC0
QD0
H
H
X
X
X
X
X
↑
QB0
QC0
QD0
QA0
= Shifting left requires external connection of QB to A, QC to B, and QD to C. Serial data is entered at input D.
H = high level (steady state), L = low level (steady state), X = irrelevant (any input including transitions)
↓ = transition from high to low level, ↑ = transition from low to high level
a, b, c, d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = the level of QA, QB, QC or QD respectively, before the indicated steady state input
conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC or QD respectively, before the most recent ↓ transition of the
clock.
†
Device type 02
INPUTS
CLEAR
L
PRESET
OUTPUTS
PRESET
ENABLE
A
B
C
D
E
L
X
X
X
X
X
CLOCK
SERIAL
QA
QB
QC
QD
QE
X
X
L
L
L
L
L
L
X
L
L
L
L
L
X
X
L
L
L
L
L
H
H
H
H
H
H
H
X
X
H
H
H
H
H
H
H
L
L
L
L
L
L
X
QA0
QB0
QC0
QD0
QE0
H
H
H
L
H
L
H
L
X
H
QB0
H
QD0
H
H
L
X
X
X
X
X
L
X
QA0
QB0
QC0
QD0
QE0
H
L
X
X
X
X
X
↑
H
H
QAn
QBn
QCn
QDn
L
L
↑
QAn QBn QCn
H = high level (steady state), L = low level (steady state),
X = irrelevant (any input including transitions), ↑ = transition from low to high level
QA0, QB0, etc. = the level of QA, QB, etc. respectively, before the indicated steady state input
conditions were established.
QAn, QBn, etc. = the level of QA, QB, etc. respectively, before the most recent ↑ transition of the
clock.
QDn
H
L
X
X
X
X
X
Figure 2. Truth tables and timing diagrams.
13
MIL-M-38510/9E
Device type 03
INPUTS
OUTPUTS
CLEAR
CLOCK
A
B
QA
QB…
.QH
L
X
X
X
L
L
L
H
L
X
X
QA0
QB0
QH0
H
↑
H
H
H
QAn
QGn
H
↑
L
X
L
QAn
QGn
H
X
L
L
↑
QGn
QAn
H = high level (steady state), L = low level (steady state),
X = irrelevant (any input including transitions),
↑ = transition from low to high level
QA0, QB0, QH0 = the level of QA, QB, or QH, respectively, before
the indicated steady state input conditions were established.
QAn, QGn = the level of QA or QG before the most recent ↑ transition
of the clock; indicates a one bit shift.
Device type 04
INPUTS
SHIFT/
CLOCK
CLOCK
LOAD
INHIBIT
L
X
X
H
L
H
H
INTERNAL
SERIAL
PARALLEL
OUTPUTS
OUTPUT
A....H
QA
QB
QH
X
a....h
a
b
h
L
X
X
QA0
QB0
QH0
L
↑
H
X
H
QAn
QGn
L
↑
L
X
L
QAn
QGn
X
X
QA0
↑
QH0
QB0
H = high level (steady state), L = low level (steady state),
X = irrelevant (any input including transitions),
↑ = transition from low to high level
a . . . . h = the level of steady state input at inputs A thru H, respectively.
QA0, QB0, QH0 = the level of QA, QB, or QH, respectively, before
the indicated steady state input conditions were established.
QAn, QGn = the level of QA or QG before the most recent ↑ transition
of the clock.
H
H
Figure 2. Truth tables and timing diagrams – Continued.
14
MIL-M-38510/9E
Device type 05
INPUTS
CLEAR
MODE
S1
CLOCK
S0
OUTPUTS
SERIAL
LEFT
PARALLEL
RIGHT
A
B
C
QA
QB
QC
QD
D
L
X
X
X
X
X
X
X
X
X
L
L
L
L
H
X
X
L
X
X
X
X
X
X
QA0
QB0
QC0
QD0
H
H
H
↑
X
X
a
b
c
d
a
b
c
d
H
L
H
↑
X
H
X
X
X
X
H
QAn
QBn
QCn
H
L
H
↑
X
L
X
X
X
X
L
QAn
QBn
QCn
H
H
L
↑
H
X
X
X
X
X
QBn
QCn
QDn
H
H
H
L
↑
L
X
X
X
X
X
QBn
QCn
QDn
L
H
L
L
X
X
X
X
X
X
X
QA0 QB0 QC0 QD0
H = high level (steady state), L = low level (steady state), X = irrelevant (any input including transitions)
↑ = transition from low to high level.
a, b, c, d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = the level of QA, QB, QC or QD respectively, before the indicated steady state input
conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC or QD respectively, before the most recent ↑ transition of the
clock.
Device type 06
INPUTS
CLEAR
SHIFT/
CLOCK
LOAD
OUTPUTS
SERIAL
PARALLEL
QA
J
K
A
B
C
D
QB
QC
QD
QD
L
X
X
X
X
X
X
X
X
L
L
L
L
H
H
L
↑
X
X
a
b
c
d
a
b
c
d
d
H
H
L
X
X
X
X
X
X
QA0
QBO
QC0
QD0
Q D0
H
H
↑
L
H
X
X
X
X
QA0
QA0
QBn
QCn
Q Cn
H
H
↑
L
L
X
X
X
X
L
QAn
QBn
QCn
Q Cn
H
H
↑
H
H
X
X
X
X
H
QAn
QBn
QCn
Q Cn
H
H
↑
H
L
X
X
X
X
QAn
QAn
QBn
QCn
Q Cn
H = high level (steady state), L = low level (steady state), X = irrelevant (any input including transitions)
↑ = transition from low to high level.
a, b, c, d = the level of steady state input at inputs A, B, C, or D, respectively.
QA0, QB0, QC0, QD0 = the level of QA, QB, QC or QD respectively, before the indicated steady state input
conditions were established.
QAn, QBn, QCn, QDn = the level of QA, QB, QC or QD respectively, before the most recent ↑ transition of the
clock.
Figure 2. Truth tables and timing diagrams – Continued.
15
MIL-M-38510/9E
Device type 01
Positive logic:
Mode control = L for right shift.
Mode control = H for left shift or parallel load.
Transfer of information to the output pins occurs when the clock input goes from a logical H to a
logical L.
Device type 02
Positive logic:
Low input of clear sets all outputs to logical L.
Clear input is independent of clock.
Preset is independent of the clock or clear inputs
The flip-flops may be independently set to the logical H state by applying a logical H to both the preset input of the
specific flip-flop and the common preset input.
Transfer of information to the output pins occurs when the clock input goes from a logical L to a logical H.
The clear input shall be a logical H and the preset input shall be at a logical L when clocking occurs.
The proper information shall appear at the R-S inputs of each flip-flop prior to the rising edge of the clock input
voltage waveform.
Figure 2. Truth tables and timing diagrams – Continued.
16
MIL-M-38510/9E
DEVICE TYPE 02
TYPICAL INPUT/OUTPUT VOLTAGE WAVEFORMS
NOTE: INPUTS NOT SHOWN ARE HELD AT LOGIC LEVEL "L".
17
MIL-M-38510/9E
Device type 03
SERIAL INPUTS A and B
OUTPUT at tn + 1
QA
H
L
L
L
INPUTS at tn
A
B
H
H
L
H
H
L
L
L
Positive logic:
tn = bit time before clock pulse.
tn + 1 = bit time after clock pulse.
Data at the serial inputs may be changed while the clock is high, but only information meeting the
setup requirements will be entered. Clocking occurs on the low to high level transition of the clock
input.
The clear input is asynchronous. Low level at clear input sets all outputs to logical low.
Figure 2. Truth tables and timing diagrams – Continued.
18
MIL-M-38510/9E
Device type 04
Positive logic:
Transfer of information to the output occurs when the clock input goes from a logical L to a logical H.
Clocking is accomplished through a 2 input positive NOR gate, permitting one input to be used as a clock inhibit
function. Holding either of the clock inputs high inhibits clocking, and holding either clock input low with the load input
high enables the other clock input. The clock inhibit should be changed to the high level only while the clock input is
high. Parallel loading is inhibited as long as the load input is high. When taken low, data at the parallel inputs are
loaded directly into the register independently of the state of the clock.
Figure 2. Truth tables and timing diagrams – Continued.
19
MIL-M-38510/9E
Device type 05
Positive logic:
The register has four distinct modes of operation, namely:
MODE CONTROL
S1
S0
Parallel (Broadside) Load
H
H
Shift Right (in the direction QA toward QD)
L
H
Shift Left (in the direction QD toward QA)
H
L
Inhibit Clock (do nothing)
L
L
In the parallel load mode, data is loaded into the associated flip-flop and appears at the output after the positive
transition of the clock input. During loading, serial data flow is inhibited. Shift right is accomplished synchronously
with the rising edge of the clock pulse when S0 is high and S1 is low. Serial data for this mode is entered at the shift
right data input. When S0 is low S1 is high, data shifts left synchronously a new data is entered at the shift left serial
input. Clocking of the flip-flops is inhibited when both mode control inputs are low. The mode controls should be
changed only while the clock input is high.
Figure 2. Truth tables and timing diagrams – Continued.
20
MIL-M-38510/9E
Device type 06
Positive logic:
The registers have two modes of operation:
Parallel (broadside) load
Shift (in direction QA toward QD)
Parallel loading is accomplished by applying the four bits of data and taking the shift/load control input low. The data
is loaded into the associated flip-flop and appears at the outputs after the positive transition of the clock input. During
loading, serial data flow is inhibited.
Shifting is accomplished synchronously when the shift/load control input is high. Serial data for this mode is entered
at the J - K inputs. These inputs permit the first stage to perform as a J - K , D-, or T-type flip-flop as shown in the
truth table.
TRUTH TABLE
Inputs at tn
Outputs at tn + 1
Q
Q
QC
QD
J
QD
A
B
K
L
H
QAn
QAn
QBn
QCn
QCn
L
L
L
QAn
QBn
QCn
QCn
H
H
H
QAn
QBn
QCn
QCn
H
L
QAn QBn QCn
QAn
H = high level, L = low level
NOTES:
1. tn = bit time before clock pulse
2. tn + 1 = bit time after clock pulse
3. QAn = state of QAn at tn.
QCn
Figure 2. Truth tables and timing diagrams – Continued.
21
MIL-M-38510/9E
Device type 01
FIGURE 3.
Logic diagrams.
22
MIL-M-38510/9E
Device type 02
FIGURE 3.
Logic diagrams - Continued.
23
MIL-M-38510/9E
Device type 03
Device type 04
FIGURE 3.
Logic diagrams - Continued.
24
MIL-M-38510/9E
Device type 05
FIGURE 3.
Logic diagrams - Continued.
25
MIL-M-38510/9E
Device type 06
FIGURE 3.
Logic diagrams - Continued.
26
MIL-M-38510/9E
NOTES:
1.
Unless otherwise specified in the notes with the individual waveforms, all pulse generators shall have
the following characteristics: tTLH ≤ 10 ns, tTHL ≤ 10 ns, VIH = 3.0 V minimum, VIL = 0 V, ZOUT = 50 Ω.
2.
CL = 50 pF minimum including jig and probe capacitance.
3.
All diodes are 1N3064 or equivalent.
4.
RL = 400 Ω ± 5%.
FIGURE 4. Switching test circuits and waveforms for device type 01.
27
MIL-M-38510/9E
NOTES:
1. Mode control input characteristics: For fMAX, PRR = 22 MHz at TC = 25°C and PRR = 16 MHz at -55°C ≤
TC ≤ 125°C. For tPLH, PRR = 1 MHz, tP = 35 ns, tTLH = tTHL ≤ 10 ns.
2. A, B, C, or D input characteristics: For fMAX, PRR = 11 MHz at TC = 25°C and PRR = 8 MHz at -55°C ≤ TC
≤ 125°C. For tPLH, PRR = 500 kHz, tP = tSETUP + tHOLD. tSETUP = 20 ns, tHOLD = 5 ns, tTLH = tTHL ≤ 10 ns.
3. Clock 1 input characteristics: When testing fMAX, PRR = 11 MHz at 25°C and PRR = 8 MHz at -55°C ≤ TC
≤ 125°C. For tPLH, PRR = 500 kHz, tP = 20 ns minimum, tTLH = tTHL ≤ 10 ns.
4. Clock 2 input characteristics: When testing fMAX, PRR = 22 MHz at 25°C and PRR = 16 MHz at -55°C ≤
TC ≤ 125°C. For tPLH, PRR = 1 MHz, tP = 20 ns minimum, tTLH = tTHL ≤ 10 ns.
5. Serial input = GND.
6. Except for input under test, all other data inputs are open.
FIGURE 4. Switching test circuits and waveforms for device type 01 - Continued.
28
MIL-M-38510/9E
NOTES:
1. Mode control input characteristics: PRR = 1 MHz, tP = 35 ns, tTLH = tTHL ≤ 10 ns.
2. Serial input characteristics: PRR = 500 kHz, tP = tSETUP + tHOLD. tSETUP = 20 ns, tHOLD = 5 ns, tTLH = tTHL ≤
10 ns.
3. Clock 1 input characteristics: PRR = 1 MHz, tP = 20 ns minimum, tTLH = tTHL ≤ 10 ns.
4. Clock 2 input characteristics: PRR = 500 kHz, tP = 20 ns minimum, tTLH = tTHL ≤ 10 ns.
5. Inputs A thru D = OPEN.
FIGURE 4. Switching test circuits and waveforms for device type 01 - Continued.
29
MIL-M-38510/9E
NOTES:
1. Unless otherwise specified in the notes with the individual waveforms, all pulse generators shall have the
following characteristics: tTLH ≤ 10 ns, tTHL ≤ 10 ns, VIH = 3.0 V minimum, VIL = 0 V, ZOUT = 50 Ω.
2. CL = 50 pF minimum including jig and probe capacitance.
3. All diodes are 1N3064 or equivalent.
4. RL = 400 Ω ± 5%.
FIGURE 5. Switching test circuits and waveforms for device type 02.
30
MIL-M-38510/9E
NOTES:
1. Serial input characteristics: For fMAX, PRR = 5 MHz at TC = 25°C, PRR = 3.5 MHz at -55°C ≤ TC ≤ 125°C. For
tPLH1, PRR = 500 kHz, tP = tSETUP + tHOLD, tSETUP = 30 ns, tHOLD = 0 ns, tTHL = tTLH ≤ 10 ns.
2. Clock input characteristics: For fMAX, PRR = 10 MHz at TC = 25°C, PRR = 7 MHz at -55°C ≤ TC ≤ 125°C. For
tPLH1, PRR = 1 MHz, tP = 35 ns, tTHL = tTLH ≤ 10 ns.
3. Clear = 4.5 V, preset enable = GND, preset A thru E = OPEN.
NOTES:
1. Serial input characteristics: PRR = 500 kHz, tTHL = tTLH ≤ 10 ns tP = tSETUP + tHOLD, tSETUP = 30 ns, tHOLD = 0 ns.
2. Clock input characteristics: PRR = 1 MHz, tTHL = tTLH ≤ 10 ns, tP = 35 ns..
3. Clear = 4.5 V, preset enable = GND, preset A thru E = OPEN.
FIGURE 5. Switching test circuits and waveforms for device type 02 - Continued.
31
MIL-M-38510/9E
NOTES:
1. Clear input characteristics: PRR = 1 MHz, tTHL = tTLH ≤ 10 ns, tP = 30 ns.
2. Preset enable characteristics: PRR = 1 MHz, tTHL = tTLH ≤ 10 ns, tP = 30 ns..
3. Preset A thru E = 4.5 V, clock = GND, serial = OPEN.
FIGURE 5. Switching test circuits and waveforms for device type 02 - Continued.
32
MIL-M-38510/9E
NOTES:
1. Unless otherwise specified in the notes with the individual waveforms, all pulse generators shall have the
following characteristics: tTLH ≤ 10 ns, tTHL ≤ 10 ns, VIH = 3.0 V minimum, VIL = 0 V, ZOUT = 50 Ω.
2. CL = 50 pF minimum, including jig and probe capacitance.
3. All diodes are 1N3064 or equivalent.
4. RL = 800 Ω ±5%.
5. QA outputs are illustrated in the individual waveforms. Relationship of serial input A and B data to other Q
outputs is illustrated in the typical shift sequence.
FIGURE 6. Switching test circuits and waveforms for device type 03.
33
MIL-M-38510/9E
NOTES:
1.
Clear input characteristics: PRR = 1 MHz, tTHL = tTLH ≤ 10 ns, tP = 50 ns maximum.
2.
Clock = GND, serial inputs A and B = OPEN.
NOTES:
1. Clock input characteristics: For fMAX, PRR = 22 MHz at TC = 25°C, PRR = 18 MHz at -55°C ≤ TC ≤ 125°C.
For tPLH2, PRR = 1 MHz, tP = 30 ns maximum, tTHL = tTLH ≤ 10 ns.
2. Serial input characteristics: For fMAX, PRR = 11 MHz at 25°C, PRR = 9 MHz at -55°C ≤ TC ≤ 125°C. For tPLH2,
PRR = 500 kHz, tP = tSETUP + tHOLD, tSETUP = 15 ns minimum, tHOLD = 10 ns maximum, tTHL = tTLH ≤ 10 ns.
3. Clear = 4.5 V.
FIGURE 6. Switching test circuits and waveforms for device type 03 - Continued.
34
MIL-M-38510/9E
NOTES:
1.
Clock input characteristics: PRR = 1 MHz, tTHL = tTLH ≤ 10 ns, tP = 30 ns maximum.
2.
Serial input characteristics: PRR = 500 kHz, tP = tSETUP + tHOLD, tSETUP = 15 ns minimum, tHOLD = 10 ns
maximum, tTHL = tTLH ≤ 10 ns.
3.
Clear = 4.5 V.
FIGURE 6. Switching test circuits and waveforms for device type 03 - Continued.
35
MIL-M-38510/9E
NOTES:
1.
Unless otherwise specified in the notes with the individual waveforms, all pulse generators shall have the
following characteristics: tTLH ≤ 10 ns, tTHL ≤ 10 ns, VIH = 3.0 V minimum, VIL = 0 V, ZOUT ≈ 50 Ω.
2.
CL = 50 pF minimum, including jig and probe capacitance
3.
All diodes are 1N3064 or equivalent.
4.
RL = 400 Ω ±5%.
FIGURE 7. Switching test circuits and waveforms for device type 04.
36
MIL-M-38510/9E
NOTES:
1. Clock input characteristics: PRR = 18 MHz at TC = 25°C, PRR = 14 MHz at -55°C ≤ TC ≤ 125°C, tTHL = tTLH ≤
10 ns, tP = 20 ns minimum.
2. Serial pulse characteristics: PRR = 9 MHz at TC = 25°C, PRR = 7 MHz at -55°C ≤ TC ≤ 125°C, tP = tSETUP +
tHOLD, tSETUP = 35 ns minimum, tHOLD = 0 ns, tTHL = tTLH ≤ 5 ns.
3. Shift load characteristics: tTLH ≤ 10 ns, tSETUP = 45 ns.
4. Clock inhibit = GND, A through H = GND.
NOTES:
1. Shift load characteristics: PRR = 1 MHz, tP = 25 ns, tTHL = tTLH ≤ 10 ns.
2. Parallel input characteristics: PRR = 500 kHz, tP = tSETUP + tHOLD = 40 ns, tSETUP = 10 ns, tHOLD = 30 ns ,
tTHL = ≤ 10 ns.
3. Clock = clock inhibit = GND, A through G = GND, serial = open.
FIGURE 7. Switching test circuits and waveforms for device type 04 - Continued.
37
MIL-M-38510/9E
NOTES:
1.
2.
3.
4.
Clock inhibit characteristics: PRR = 1 MHz, tP2 = 50 ns, tTHL = tTLH ≤ 10 ns, tSETUP2 = 34 ns.
Clock pulse characteristics: PRR = 1 MHz, tP1 = 25 ns, tTHL = tTLH ≤ 10 ns.
Serial pulse characteristics: PRR = 500 kHz, tP3 = tSETUP + tHOLD, tSETUP = 35 ns, tHOLD = 0, tTHL = tTLH ≤ 5 ns.
Shift/load = 5.0 V.
NOTES:
1.
(H) input characteristics: PRR = 1 MHz, 50% duty cycle, tTHL = tTLH ≤ 10 ns.
2.
Shift/load = GND, clock inhibit = GND, serial = GND, A thru G = GND, clock = GND..
FIGURE 7. Switching test circuits and waveforms for device type 04 - Continued.
38
MIL-M-38510/9E
NOTES:
1. CL = 50 pF minimum including probe and jig capacitance.
2. All diodes are 1N3064, or equivalent.
3. Unless otherwise specified in the notes associated with the individual tests, all pulse generators have the
following characteristics: ZOUT ≈ 50 Ω, tTLH ≤ 7 ns, tTHL ≤ 7 ns, VIH = 3.0 V minimum, VIL = 0.
4. RL = 400 Ω ±5%.
FIGURE 8. Switching test circuits and waveforms for device type 05.
39
MIL-M-38510/9E
NOTES:
1.
The clear pulse has the following characteristics: tP(CLEAR) = 20 ns, tSETUP = 25 ns, PRR = 1 MHz.
2.
The clock pulse has the following characteristics: tP(CLOCK) = 20 ns, PRR = 1 MHz.
NOTES:
1.
The clear pulse is a momentary ground, then VIH is applied to the input. tP(CLEAR) ≤ 75 ns, tTHL ≤ 15 ns and
tTLH ≤ 15 ns, tSETUP = 25 ns.
2.
Clock pulse characteristics: tP(CLOCK) = 20 ns, PRR = 2 MHz.
3.
Data pulse characteristics: tP(DATA) = t(SETUP2) + tHOLD, tSETUP2 = 20 ns, tHOLD = 7 ns, PRR = 1 MHz.
FIGURE 8. Switching test circuits and waveforms for device type 05 - Continued.
40
MIL-M-38510/9E
NOTES:
1.
Clock pulse characteristics: tP(CLOCK) = 20 ns, PRR = 2 MHz.
2.
Data pulse characteristics: tP(DATA) = tSETUP = 20 ns, PRR = 1 MHz.
NOTES:
1.
The clear pulse is a momentary GND, then VIH is applied to the input, tP(CLEAR) ≤ 20 ns, tTHL ≤ 15 ns, tTLH ≤ 15
ns.
2.
Clock pulse characteristics: tP(CLOCK) = 20 ns, PRR = 18 MHz at -55°C ≤ TC ≤ 125°C (22 MHz at TC = 25°C).
3.
Data pulse characteristics: tP(DATA) = tSETUP = 20 ns, PRR = 9 MHz at -55°C ≤ TC ≤ 125°C (11 MHz at TC =
25°C).
FIGURE 8. Switching test circuits and waveforms for device type 05 - Continued.
41
MIL-M-38510/9E
NOTES:
1.
Unless otherwise specified in the notes with the individual waveforms, all pulse generators shall have the
following characteristics: tTLH ≤ 7 ns, tTHL ≤ 7 ns, VIH = 3.0 V minimum, VIL = 0, ZOUT ≈ 50 Ω.
2.
CL = 50 pF minimum, including jig and probe capacitance.
3.
All diodes are 1N3064 or equivalent.
4.
RL = 400 Ω ±5%.
NOTES:
1.
The clear pulse is a momentary GND, then VIH is applied to the input. tTLH ≤ 15 ns, tTHL ≤ 15 ns, tP(CLEAR) ≤
75 ns.
2.
Clock pulse characteristics: tP(CLOCK) = 16 ns, PRR = 24 MHz at -55°C ≤ TC ≤ 125°C (30 MHz at TC = 25°C),
VIH = 3.0 V minimum, VIL = GND.
FIGURE 9. Switching test circuits and waveforms for device type 06.
42
MIL-M-38510/9E
NOTES:
1.
Clear pulse characteristics: tP(CLEAR) = 12 ns, tSETUP = 25 ns, PRR = 1 MHz.
2.
Clock pulse characteristics: tP(CLOCK) = 16 ns, PRR = 1 MHz.
NOTES:
1.
2.
3.
4.
The clear pulse is a momentary GND, then VIH is applied to the clear input.
Clock pulse characteristics: tP(CLOCK) = 16 ns, PRR = 2 MHz.
Data pulse characteristics: tP(DATA) = 25 ns, tSETUP1 = 25 ns, tHOLD = 0 ns, PRR = 1 MHz.
Shift/Load pulse characteristics: tP(SHIFT) = 17 ns, tRELEASE = 10 ns, tSETUP2 = 27 ns, PRR = 2 MHz.
FIGURE 9. Switching test circuits and waveforms for device type 06 - Continued.
43
MIL-M-38510/9E
NOTES:
1.
The clear pulse is a momentary GND, then VIH is applied to the clear input.
2.
Clock pulse characteristics: tP(CLOCK) = 16 ns, PRR = 2 MHz.
3.
Data pulse characteristics: tP(DATA) = tSETUP + tHOLD = 25 ns, tSETUP1 = 25 ns, tHOLD = 0 ns, PRR = 1 MHz.
4.
Shift/load pulse characteristics: tP(SHIFT) = 22 ns, tRELEASE = 10 ns, tSETUP2 = 32 ns, PRR = 2 MHz.
FIGURE 9. Switching test circuits and waveforms for device type 06 - Continued.
44
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
1
Symbol
VOH
“
“
“
“
”
“
’‘
VOL
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
VIC
“
“
“
"
“
“
“
45
Min
4.5 V
"
"
"
QA
QB
QC
QD
2.4
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
QA
QB
QC
QD
SI
A
B
C
D
MC
CLK2
CLK1
SI
A
B
C
D
CLK2
CLK1
"
MC
3/
2.4 V
"
"
"
"
"
"
"
SI
A
B
C
D
CLK2
CLK1
40
"
“
“
“
“
“
µA
"
“
“
“
“
“
5.5 V
"
"
"
"
"
"
"
SI
A
B
C
D
CLK2
CLK1
100
"
“
“
“
“
“
"
"
“
“
“
“
“
2
3
4
5
6
7
8
9
10
11
12
13
14
A
B
C
D
MC
GND
CLK2
CLK1
QD
QC
QB
QA
VCC
GND
"
"
"
A 1/
"
"
"
-.8 mA
2.0 V
2.0 V
"
"
"
"
"
"
"
"
"
"
"
16 mA
0.8 V
"
"
"
"
2.0 V
2.0 V
2.0 V
3007
“
“
“
5
6
7
8
IIL1
“
“
“
“
“
“
3009
“
“
“
“
“
“
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
IIL2
“
24
“
“
“
“
“
“
“
IIH1
"
“
“
“
“
“
3010
“
“
“
“
“
“
25
26
27
28
29
30
31
2.4 V
“
“
“
“
“
“
“
IIH2
"
“
“
“
“
“
3010
“
“
“
“
“
“
32
33
34
35
36
37
38
5.5 V
See footnotes at end of device type 01.
Meas.
terminal
1
SI
0.8 V
0.8 V
0.8 V
-12 mA
GND
4.5 V
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.4 V
"
4.5 V
GND
"
"
"
"
4.5 V
"
"
"
"
"
"
"
4.5 V
GND
"
"
"
"
4.5 V
"
"
"
"
"
"
"
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
2.4 V
2.4 V
2.4 V
2.4 V
5.5 V
5.5 V
5.5 V
5.5 V
-.8 mA
-.8 mA
-.8 mA
16 mA
16 mA
16 mA
-12 mA
-12 mA
0.4 V
0.4 V
4.5 V
2.4 V
5.5 V
Max
Unit
V
“
“
“
0.4
“
“
“
“
“
“
“
-1.5
"
"
"
"
“
“
“
2/
“
“
“
“
“
“
“
“
“
“
"
“
“
“
MIL-M-38510/9E
TC = 25°C
“
“
MILCase A,B,C,D
STD-883
Test No.
method
3006
1
“
2
“
3
“
4
TABLE III. Group A inspection for device type 01. - Continued
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILCase A,B,C,D
STD-883
Test No.
method
3010
39
2
3
4
5
6
7
8
9
10
11
12
13
14
A
B
C
D
MC
GND
CLK2
CLK1
QD
QC
QB
QA
VCC
2.4 V
GND
GND
5.5 V
MC
80
µA
5.5 V
"
GND
"
MC
200
µA
"
"
"
"
QA
QB
QC
QD
-57
“
“
“
mA
“
“
“
"
VCC
72
"
1
IIH3
TC = 25°C
“
“
“
”
IIH4
“
40
IOS
“
“
“
3011
“
“
“
41
42
43
44
4.5 V
"
"
"
4.5 V
"
"
"
4.5 V
"
"
"
4.5 V
"
"
"
4.5 V
"
"
"
"
“
“
“
A
"
"
"
3005
45
GND
GND
GND
GND
"
"
"
“
ICCH
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C and VIC tests are omitted.
7
Truth
table
test
46
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5/
“
“
"
“
“
“
“
“
“
“
“
“
"
"
“
“
“
“
“
“
“
“
“
“
“
3014
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
"
"
"
"
"
"
"
"
"
"
"
"
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
See footnotes at end of device type 01.
B
"
"
"
A
A
A
B
B
B
A
A
A
B
B
B
A
A
A
B
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
A
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
GND
GND
GND
GND
B
"
"
"
"
A
B
B
A
B
B
A
B
B
A
B
B
A
B
B
A
B
A
B
A
B
A
B
B
X
X
L
"
"
"
"
"
"
"
"
"
"
"
"
H
H
H
L
L
L
H
H
L
L
H
H
L
L
X
X
L
"
"
"
"
"
"
"
"
"
H
H
H
L
L
L
H
H
H
L
L
H
H
L
"
"
"
X
X
L
"
"
"
"
"
"
H
H
H
L
L
L
H
H
H
L
L
L
H
H
L
"
"
"
"
"
X
X
L
"
"
"
H
H
H
L
L
L
H
H
H
L
L
L
H
H
H
L
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Min
-18
"
"
"
Max
Unit
6/
MIL-M-38510/9E
TC = 25°C
4/, 7/
“
“
“
“
“
“
“
Meas.
terminal
1
SI
TABLE III. Group A inspection for device type 01. - Continued
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
7
TC = 25°C
4/, 7/
“
“
“
“
“
“
“
47
“
“
Symbol
Truth
table
test
5/
“
“
"
“
“
“
“
“
MILCase A,B,C,D
STD-883
Test No.
method
3014
75
“
76
“
77
“
78
“
79
“
80
“
81
“
82
“
83
“
84
“
85
“
86
1
2
3
4
5
6
7
8
9
10
11
12
13
14
SI
A
B
C
D
MC
GND
CLK2
CLK1
B
"
"
"
"
"
"
"
"
"
"
"
A
A
A
B
B
B
A
A
A
B
B
B
B
B
B
A
"
"
"
"
"
B
B
B
A
A
A
B
B
B
A
A
A
B
B
B
B
B
B
A
"
"
"
"
"
B
B
B
A
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
B
A
B
B
A
B
B
A
B
B
A
B
B
"
"
"
"
"
"
"
"
"
"
"
QD
L
"
"
"
"
H
"
"
"
"
"
L
QC
L
L
H
H
H
L
L
L
H
H
H
L
QB
L
"
"
"
"
H
"
"
"
"
"
L
QA
L
L
H
H
H
L
L
L
H
H
H
L
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
GND
GND
IN
IN
OUT
IN
5.0 V
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
IN
"
"
"
OUT
OUT
Min
Max
Unit
6/
+125° C and TC = -55° C.
Repeat subgroup 7 at TC =
9
fMAX
(Fig. 4)
87
GND
TC = 25°C
“
“
“
tPLH
“
“
"
3003
(Fig. 4)
“
“
88
89
90
91
"
"
"
"
”
“
“
’‘
tPHL
“
“
“
“
“
“
“
92
93
94
95
IN
"
"
"
10
fMAX
(Fig. 4)
96
GND
TC = 125°C
“
“
“
tPLH
“
“
"
3003
(Fig. 4)
“
“
97
98
99
100
"
"
"
"
”
“
“
’‘
tPHL
“
“
“
“
“
“
“
101
102
103
104
IN
"
"
"
IN
IN
IN
IN
IN
IN
IN
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
See footnotes at end of device type 01.
GND
GND
IN
IN
5.0 V
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
IN
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
10
“
“
"
30
“
“
"
"
"
"
"
QA
QB
QC
QD
“
“
“
“
35
“
“
“
MHz
ns
“
“
“
“
“
“
“
QD
8
"
"
"
"
QA
QB
QC
QD
10
“
“
"
42
“
“
"
ns
“
“
“
OUT
"
"
"
"
QA
QB
QC
QD
“
“
“
“
49
“
“
“
“
“
“
“
OUT
OUT
11
QA
QB
QC
QD
5.0 V
OUT
OUT
QD
"
"
"
"
OUT
OUT
OUT
5.0 V
MHz
MIL-M-38510/9E
8
11
Meas.
terminal
TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
1/ A = normal clock pulse, except for subgroups 7 and 8 (see 4/).
2/ For device type 01, with schematics incorporating a 4 kΩ base resistor, the minimum and maximum limits shall be -0.5 and -1.4 mA, respectively. For schematics
incorporating a 5 kΩ base resistor, the minimum and maximum limits shall be -0.5 and -1.4 mA, respectively. For schematics incorporating a 6 kΩ resistor, the
minimum and maximum limits shall be -0.4 and -1.3 mA, respectively.
3/ For device type 01, with schematics incorporating a 4 kΩ base resistor in the mode control input circuit, the minimum and maximum limits shall be -1.4 and -3.2 mA,
respectively. For schematics incorporating a 5 kΩ base resistor, the minimum and maximum limits shall be -1.0 and -2.8 mA, respectively. For schematics
incorporating a 6 kΩ resistor in the mode control input circuit, the minimum and maximum limits shall be -0.8 and -2.6 mA, respectively.
4/ For subgroups 7 and 8, A = VCC, B = GND, and X = indeterminate.
5/ The tests in subgroups 7 and 8 shall be performed in the sequence specified.
6/ Output voltages shall be either:
(a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator or
(b) H > 1.5 V and L < 1.5 V when using a high speed checker single comparator.
7/ Only a summary of attribute data is required.
MIL-M-38510/9E
48
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
1
Cases E, F
VOH
STD-883
method
3006
Test No.
1
TC = 25°C
“
“
“
“
“
“
“
“
1
2
3
4
5
6
7
8
9
10
PB
PC
VCC
PD
PE
2
2.0 V
"
2.0 V
"
4.5 V
"
2.0 V
"
2.0 V
"
P EN
2.0 V
"
3
"
"
"
"
"
"
"
“
4
"
"
"
"
"
"
"
“
“
5
"
"
"
"
"
"
"
”
VOL
3007
6
"
0.8 V
"
“
“
“
7
"
"
"
’‘
“
8
"
"
"
“
“
“
“
9
"
"
“
"
"
10
"
"
“
VIC
“
11
“
“
“
12
“
“
“
13
“
“
“
14
“
“
-12 mA
-12 mA
-12 mA
-12 mA
"
QE
"
“
0.8 V
QA
0.4
"
QB
“
“
"
QC
“
“
"
"
QD
“
“
"
"
QE
"
16 mA
16 mA
“
49
“
"
“
"
"
PC
"
“
"
PD
"
"
"
"
"
"
PE
P EN
"
"
"
SI
"
“
CLR
"
“
mA
17
"
“
18
"
“
“
“
19
"
“
IIL1
3009
20
“
“
“
21
“
“
“
22
“
“
“
23
“
“
“
24
"
“
“
“
25
"
“
“
"
“
26
"
27
"
-12 mA
-12 mA
-12 mA
-12 mA
"
5.5 V
-12 mA
"
CLK
-0.7
-1.6
"
4.5 V
"
PA
"
“
“
"
"
"
PB
"
“
“
"
"
PC
"
“
“
"
"
PD
"
"
“
"
PE
SI
"
"
“
"
"
“
CLR
"
"
“
"
P EN
-3.0
-8.0
“
"
CLK
40
µA
"
“
IIL1
“
28
“
IIH1
3010
29
“
“
“
30
“
“
“
31
“
“
“
32
“
“
“
33
"
“
“
“
34
"
“
“
“
35
"
“
“
“
36
"
See footnotes at end of device type 02.
“
"
"
"
"
0.4 V
0.4 V
"
0.4 V
"
"
4.5 V
4.5 V
0.4 V
"
2.4 V
"
PB
“
2.4 V
QD
"
“
2.4 V
"
"
“
4.5 V
“
"
-1.5
"
4.5 V
“
"
PA
"
4.5 V
"
QC
CLK
15
2.4 V
QB
"
16 mA
Unit
V
"
16
0.4 V
"
-.4 mA
Max
"
"
0.4 V
Min
2.4
-.4 mA
CLR
2.0 V
Test limits
Meas.
terminal
"
"
“
16 mA
16 mA
16
QA
"
-.4 mA
QA
-.4 mA
"
-.4 mA
QB
15
"
"
0.4 V
QC
14
“
“
"
"
0.4 V
GND
GND
13
0.4 V
"
GND
"
PA
"
“
"
"
"
PB
“
“
"
"
"
PC
“
“
"
"
PD
“
“
"
PE
SI
"
“
"
“
CLR
"
“
2.4 V
2.4 V
"
2.4 V
"
"
2.4 V
MIL-M-38510/9E
PA
SI
QD
12
2.0 V
"
CLK
QE
11
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
1
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
Test No.
37
TC = 25°C
“
“
38
“
“
“
39
“
“
“
40
“
“
“
41
"
“
“
“
42
"
“
“
“
43
"
“
“
“
44
"
"
IIH3
"
45
IIH4
“
46
GND
GND
GND
GND
GND
GND
"
"
GND
GND
GND
GND
2.4 V
5.5 V
"
"
"
”
IOS
3011
47
4.5 V
4.5 V
4.5 V
"
4.5 V
4.5 V
4.5 V
"
“
“
“
48
"
"
"
"
"
"
"
"
’‘
“
49
"
"
"
"
"
"
"
"
“
“
“
“
50
"
"
"
"
"
"
"
“
"
"
51
"
"
"
"
"
"
"
“
ICCH
3005
52
4.5 V
"
"
"
"
"
"
"
“
ICCL
3005
53
GND
"
"
"
"
"
"
GND
2
50
3
CLK
5.5 V
PA
PB
PC
VCC
PD
PE
P EN
SI
QE
QD
5.5 V
5.5 V
5.5 V
5.5 V
GND
GND
13
QC
14
QB
15
QA
16
CLR
Min
Max
100
Unit
µA
"
GND
"
PA
"
“
"
"
"
PB
“
“
"
"
"
PC
“
“
"
"
PD
“
“
"
PE
"
“
"
SI
"
“
CLR
"
“
P EN
200
"
P EN
500
“
-57
mA
5.5 V
5.5 V
"
5.5 V
"
5.5 V
GND
4.5 V
QA
-20
"
QB
"
“
“
"
QC
"
“
“
"
"
QD
"
“
“
"
"
QE
"
"
GND
"
5.5 V
VCC
68
“
“
GND
"
GND
VCC
68
“
GND
GND
GND
GND
Same tests, terminal conditions and limits as for subgroup 1, except TC = +125° C and VIC tests are omitted.
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C and VIC tests are omitted.
7
Truth
3014
54
B
B
B
B
4.5 V
B
B
B
B
L
L
GND
L
L
L
B
TC = 25°C
1/, 4/
table
“
55
"
A
B
B
"
"
"
A
A
"
"
"
L
L
H
"
test
"
56
"
B
A
B
"
"
"
"
"
"
"
"
L
H
L
"
“
"
57
"
"
B
A
"
"
"
"
"
"
"
"
H
L
"
"
“
3/
"
"
58
"
"
"
B
"
A
"
"
"
"
H
"
L
"
"
"
“
“
“
59
"
"
"
B
"
B
A
"
"
H
L
"
"
"
"
"
“
“
“
60
"
"
"
B
"
B
"
B
"
L
L
"
"
"
"
"
“
"
"
61
"
A
A
A
"
A
"
B
B
L
L
"
"
"
"
A
B
“
“
“
62
"
"
"
"
"
"
"
A
A
H
H
"
H
H
H
“
“
“
63
"
"
"
"
"
"
B
B
A
L
L
"
L
L
L
B
“
“
“
64
"
"
"
"
"
"
"
B
B
"
L
"
L
L
L
A
“
“
“
65
"
"
"
"
"
"
"
A
B
"
H
"
H
H
H
A
“
“
“
66
"
"
"
"
"
"
"
B
A
"
H
"
H
H
H
A
“
“
"
“
67
"
"
"
"
"
B
"
B
A
"
L
"
L
L
L
B
"
68
"
"
"
"
"
B
"
B
B
"
L
"
L
L
L
A
“
Test limits
Meas.
terminal
CLK
See footnotes at end of device type 02.
2/
MIL-M-38510/9E
IIH2
STD-883
method
3010
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSTD-883
method
3014
Cases E, F
1
2
Subgroup
Symbol
7
Truth
TC = 25°C
table
“
70
"
"
1/, 4/
test
"
71
"
"
“
3/
"
"
72
"
"
“
"
73
"
"
“
“
“
74
"
"
“
“
“
75
"
"
Test No.
69
CLK
B
3
4
5
6
7
8
9
10
11
PA
PB
PC
VCC
PD
PE
A
A
A
4.5 V
B
B
QD
L
"
A
"
B
A
"
"
B
"
"
"
"
"
"
B
A
"
"
"
"
"
"
B
B
"
"
"
"
"
A
B
"
"
"
"
"
B
B
"
"
"
"
"
14
15
16
QC
QB
QA
H
H
H
"
"
H
H
H
A
"
L
L
L
B
"
"
"
"
L
L
A
"
"
"
"
H
H
A
A
"
"
"
"
H
H
A
B
A
"
"
"
"
L
L
B
"
B
B
"
"
"
"
"
L
A
SI
B
L
13
GND
GND
P EN
A
QE
12
CLR
A
"
"
76
"
"
"
"
“
“
“
77
"
"
"
"
"
"
"
A
B
"
"
"
"
"
H
A
“
“
“
78
"
"
"
"
"
"
"
B
A
"
"
"
"
"
H
A
“
“
“
79
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
B
“
“
“
80
"
"
"
"
"
"
"
"
"
"
"
"
"
"
L
A
“
“
“
81
A
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
“
“
“
"
“
82
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
83
A
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
84
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
85
A
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
86
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
87
A
"
"
"
“
"
"
"
"
88
B
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
“
“
89
A
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
“
“
“
“
90
B
"
A
"
"
"
"
A
B
"
"
"
"
"
"
“
"
"
91
A
"
A
"
"
"
"
"
"
"
"
"
"
"
L
"
“
“
“
92
B
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
“
“
“
93
A
"
"
"
"
"
"
"
"
"
"
"
"
L
"
"
“
“
“
94
B
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
“
“
“
95
A
"
"
"
"
A
"
"
"
"
"
"
L
"
"
"
“
“
“
96
B
"
"
"
"
B
A
"
"
"
"
"
"
"
"
"
“
“
“
97
A
"
"
"
"
"
A
"
"
"
L
"
"
"
"
"
“
“
“
98
B
"
"
"
"
"
B
B
"
"
"
"
"
"
"
"
“
“
“
99
A
A
"
"
"
"
"
"
"
L
"
"
"
"
"
"
“
“
“
100
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
“
“
“
101
A
"
"
"
"
"
"
"
A
"
"
"
"
"
H
"
“
“
"
“
102
B
"
"
"
"
"
"
A
B
"
"
"
"
"
"
"
"
"
"
"
A
B
"
"
"
"
H
"
"
“
"
103
A
See footnotes at end of device type 02.
"
"
Min
Max
Unit
2/
MIL-M-38510/9E
51
“
"
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSTD-883
method
3014
Cases E, F
1
2
Subgroup
Symbol
7
Truth
TC = 25°C
1/, 4/
table
“
105
A
"
test
"
106
B
"
“
3/
"
"
107
A
"
“
"
108
B
"
“
“
“
109
A
"
“
“
“
110
B
"
“
"
"
111
A
“
“
“
112
“
“
“
113
“
“
“
114
Test No.
104
3
4
5
6
7
8
9
10
11
L
15
16
PC
VCC
PD
PE
A
B
4.5 V
B
B
GND
GND
QC
QB
QA
L
H
H
A
"
"
"
"
"
"
A
"
"
"
B
"
"
"
"
"
"
"
"
H
"
L
"
"
"
"
"
"
A
"
"
"
"
"
"
H
"
B
"
A
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
A
"
"
"
H
"
"
L
"
"
"
"
"
"
B
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
L
"
"
"
"
"
B
"
"
"
"
"
B
B
"
"
L
"
"
"
"
"
A
"
"
"
"
"
"
B
"
L
L
"
"
"
"
"
B
"
A
"
"
A
"
A
A
L
H
"
"
H
"
"
"
CLR
A
52
“
“
“
115
A
"
A
"
"
A
"
"
"
H
H
"
H
H
H
“
“
“
116
B
A
B
A
"
B
A
"
"
"
H
"
"
H
"
"
“
“
“
"
“
117
A
"
"
"
"
"
"
"
"
"
L
"
"
L
"
B
"
118
B
"
"
"
"
"
"
"
B
"
L
"
"
L
"
A
"
"
"
"
"
H
"
"
H
"
"
"
"
"
"
H
"
"
H
"
"
"
"
"
119
A
"
"
"
"
"
"
“
120
B
"
A
"
"
A
"
"
"
121
A
"
"
"
"
"
"
"
"
"
H
"
"
H
"
"
“
"
"
"
122
B
"
"
"
"
"
"
B
A
L
L
"
L
L
L
B
"
123
A
"
"
"
"
"
"
B
A
L
L
"
L
L
L
B
OUT
“
8
Test limits
Meas.
terminal
Min
Max
Unit
2/
MIL-M-38510/9E
PB
SI
B
QD
14
B
P EN
A
L
13
PA
CLK
B
QE
12
Repeat subgroup 7 at TC = +125° C and TC = -55° C.
9
fMAX
(Fig 5)
124
IN
5.0 V
GND
IN
TC = 25°C
“
tPLH1
“
3003
125
"
"
“
"
"
(Fig 5)
126
"
"
“
"
"
“
“
“
127
"
"
“
"
"
“
“
“
128
"
"
“
"
”
“
“
129
"
"
“
"
"
tPHL1
"
130
"
"
“
"
"
“
“
“
131
"
"
“
"
"
“
“
“
132
"
"
“
"
"
“
“
“
133
"
"
“
"
”
“
“
134
"
"
“
"
See footnotes at end of device type 02.
GND
OUT
OUT
OUT
OUT
4.5 V
QE
5
“
QA
8
40
“
QB
“
“
“
“
QC
“
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
“
QA
"
"
"
OUT
OUT
OUT
OUT
MHz
ns
“
QB
“
“
“
“
QC
“
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
OUT
OUT
TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MIL-
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
Subgroup
Symbol
9
tPLH2
STD-883
method
3003
TC = 25°C
“
(Fig 5)
136
"
"
“
"
“
“
“
137
"
"
“
"
“
“
“
138
"
"
“
”
“
“
139
"
"
“
"
tPHL3
"
140
"
"
“
"
“
“
“
141
"
"
“
"
“
“
“
142
"
"
“
"
“
“
“
143
"
"
“
”
“
“
144
"
"
“
Test No.
135
CLK
GND
PA
PB
PC
VCC
PD
PE
4.5 V
4.5 V
4.5 V
5.0 V
4.5 V
4.5 V
P EN
IN
SI
QE
QD
OUT
OUT
OUT
OUT
GND
GND
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
“
QA
"
55
ns
“
“
“
“
“
“
"
“
QD
“
“
"
“
QE
“
“
“
“
4.5 V
QE
3.5
“
QA
8
56
“
QB
“
“
“
“
QC
“
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
“
QA
"
"
"
“
QB
“
“
“
“
QC
“
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
IN
QA
8
59
"
GND
IN
"
“
"
"
“
(Fig 5)
147
"
"
“
"
"
“
“
“
148
"
"
“
"
"
“
“
“
149
"
"
“
"
”
“
“
150
"
"
“
"
"
tPHL1
"
151
"
"
“
"
"
“
“
“
152
"
"
“
"
"
“
“
“
153
"
"
“
"
"
“
“
“
154
"
"
“
"
”
“
“
155
"
"
“
"
"
"
156
GND
IN
"
"
"
tPLH2
“
"
157
"
"
“
"
"
“
“
“
158
"
"
“
"
"
“
“
“
159
"
"
“
"
”
“
“
160
"
"
“
"
"
tPHL3
"
161
"
"
“
"
"
“
“
“
162
"
"
“
"
"
“
“
“
163
"
"
“
"
"
“
“
“
164
"
"
“
"
”
“
“
165
"
"
“
"
11
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MHz
ns
“
QB
“
“
“
“
QC
“
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
“
QA
"
77
"
OUT
OUT
“
QB
“
“
“
“
QC
“
“
“
"
“
QD
“
“
“
"
“
QE
“
“
“
OUT
OUT
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
1/ For subgroups 7 and 8, A = VCC and B = GND.
2/ Output voltages shall be either: (a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or
(b) H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
3/ The tests in subgroups 7 and 8 shall be performed in the sequence specified.
4/ Only a summary of attributes data is required.
MIL-M-38510/9E
53
QB
QC
"
4.5 V
OUT
“
"
4.5 V
OUT
“
IN
OUT
Unit
ns
“
146
OUT
Max
42
“
145
OUT
Min
8
“
3003
OUT
QA
“
(Fig 5)
"
OUT
CLR
IN
Test limits
Meas.
terminal
QB
fMAX
4.5 V
QA
OUT
16
QC
tPLH1
4.5 V
QB
15
“
10
4.5 V
QC
14
“
TC = 125°C
“
OUT
13
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup Symbol STD-883
method
Cases
A, B, C, D
Test No.
1
2
3
SIA
SIB
QA
-0.4 mA
4
QB
5
QC
6
QD
7
8
9
4.5 V
QA
2.4
"
“
QB
"
“
“
"
"
“
QC
"
“
“
“
3
"
"
“
“
“
4
"
"
“
"
"
“
“
“
5
"
"
“
"
"
”
“
“
6
"
"
“
"
"
“
“
“
7
"
"
“
"
"
“
"
"
“
"
"
8
"
"
9
0.8 V
0.8 V
“
“
“
“
10
"
"
“
“
11
"
"
“
“
“
12
"
"
“
"
"
13
"
"
8 mA
8 mA
8 mA
8 mA
“
“
QF
"
“
“
QG
"
“
“
QH
"
“
QA
“
“
QB
"
QC
"
“
“
"
"
“
QD
"
“
“
"
"
"
QE
"
"
8 mA
0.4
“
QF
"
"
“
QG
"
"
“
QH
"
“
“
“
SIA
-1.5
“
“
“
"
“
“
SIB
CLK
"
“
“
CLR
"
“
5.5 V
SIA
7/
“
“
SIB
CLK
"
"
“
"
"
"
"
“
"
"
“
“
“
16
"
"
“
"
"
“
VIC
17
-12 mA
“
“
18
“
“
19
“
“
“
20
“
“
IIL1
3009
21
0.4 V
5.5 V
“
5.5 V
0.4 V
“
23
“
"
“
14
22
-0.4 mA
"
QE
"
15
“
-0.4 mA
QD
"
“
“
-0.4 mA
“
“
"
"
“
-0.4 mA
V
"
“
“
QH
“
"
“
QG
“
“
“
QF
“
“
“
-12 mA
QE
“
-12 mA
-12 mA
0.4 V
“
8 mA
8 mA
“
IIL2
“
24
“
CLR
8/
“
IIH1
3010
25
2.4 V
GND
“
“
SIA
40
µA
“
“
“
26
GND
2.4 V
“
“
"
"
“
“
“
27
“
SIB
CLK
"
“
“
"
28
5.5 V
GND
“
“
SIA
100
"
“
IIH2
“
“
29
GND
5.5 V
“
"
“
“
“
30
“
“
IIH3
“
31
“
“
IIH4
“
32
“
“
See footnotes at end of device type 03.
0.4 V
8 mA
2.4 V
“
SIB
"
“
CLK
"
“
2.4 V
“
CLR
9/
“
5.5 V
“
CLR
10/
“
5.5 V
MIL-M-38510/9E
54
“
Unit
4.5 V
"
3007
Max
"
2.0 V
"
“
VCC
Min
A 1/
2.0 V
2
VOL
Test limits
Meas.
terminal
“
1
“
’‘
14
GND
3006
“
“
13
CLR
VOH
-0.4 mA
12
CLK
1
-0.4 mA
11
GND
TC = 25°C
“
-0.4mA
10
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILSTD-883
method
Cases
A, B, C, D
Test No.
1
2
3
SIA
SIB
QA
GND
4
QB
5
QC
6
QD
7
8
9
13
14
VCC
Min
Max
Unit
GND
A
4.5 V
5.5 V
QA
-10
-27.5
mA
“
"
"
“
QB
"
"
“
“
"
"
“
QC
"
"
“
“
"
"
“
QD
"
"
“
“
QE
"
"
“
3011
33
4.5 V
4.5 V
“
“
34
"
"
“
“
35
"
"
“
“
“
36
"
"
“
“
“
37
"
"
“
"
"
”
“
“
38
"
"
“
"
"
“
“
“
39
"
"
“
"
"
’‘
“
“
40
"
"
“
"
"
“
ICC1
3005
41
GND
GND
“
0.4 V
“
ICC2
3005
42
GND
GND
“
2.4 V
QE
QF
QG
QH
GND
“
QF
"
"
“
“
QG
"
"
“
“
QH
"
"
“
B 2/
“
VCC
44
“
B
“
VCC
54
“
55
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = +125° C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C and VIC tests are omitted.
GND
GND
GND
7
Truth
3014
43
L
L
“
L
“
B
44
L
“
A
“
A
“
GND
table
A
“
L
TC = 25°C
“
3/ 6/
test
"
45
“
“
L
“
“
“
“
A
B
A
“
“
5/
“
46
“
“
“
“
“
A
“
“
“
“
“
“
"
"
47
“
“
H
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
“
48
“
“
“
“
“
A
“
“
“
“
“
“
"
49
“
“
“
H
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
50
“
“
“
“
“
A
“
“
“
“
“
“
“
"
51
“
“
“
“
H
“
"
“
"
“
B
“
“
“
“
“
“
“
“
"
52
“
“
“
“
“
“
A
“
“
“
“
“
“
“
"
"
53
“
“
“
“
“
H
“
“
B
“
“
“
“
“
"
“
“
“
54
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
“
55
“
“
“
“
“
“
“
B
“
H
“
“
“
“
“
“
"
“
56
“
“
“
“
“
“
“
A
“
“
"
“
"
"
57
“
“
“
“
“
“
“
B
“
“
H
“
"
“
"
"
“
“
“
“
58
“
“
“
“
“
“
“
A
“
“
“
“
“
“
59
“
“
“
“
“
“
“
B
“
“
“
H
“
"
“
"
“
“
"
"
60
“
“
“
“
“
“
“
A
“
“
“
“
H
“
“
“
“
“
“
“
A
“
“
“
“
"
“
“
“
61
L
“
L
“
L
“
L
“
4.5 V
“
“
“
“
"
“
“
“
“
62
B
“
“
“
“
“
“
“
B
“
“
“
“
"
“
“
"
“
63
“
“
L
“
“
“
“
A
“
“
“
“
"
“
“
"
“
64
“
“
L
“
“
“
“
B
“
“
“
“
"
“
See footnotes at end of device type 03.
4/
MIL-M-38510/9E
“
Test limits
Meas.
terminal
CLR
IOS
GND
12
CLK
1
GND
11
GND
TC = 25°C
“
GND
10
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILSTD-883
method
Cases
A, B, C, D
Test No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
SIA
SIB
QA
QB
QC
QD
GND
CLK
CLR
QE
QF
QG
QH
VCC
A
“
H
“
H
“
H
“
H
“
4.5 V
“
“
“
“
“
"
Truth
3014
65
66
A
“
L
“
L
“
H
"
H
“
A
“
B
“
GND
table
“
test
"
67
“
“
“
“
L
“
“
B
A
“
5/
“
68
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
69
“
“
“
“
“
L
“
A
“
“
“
“
“
“
“
“
"
“
70
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
71
“
“
“
“
“
“
“
A
“
L
“
“
“
“
“
“
"
72
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
73
“
“
“
“
“
“
“
A
“
“
L
“
“
“
“
“
"
74
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
75
“
“
“
“
“
“
“
A
“
“
“
L
"
"
“
“
“
76
“
“
“
“
“
“
“
B
“
“
“
“
"
“
“
“
“
77
“
“
“
“
“
“
“
A
“
“
“
“
L
“
“
"
“
78
A
“
"
“
“
“
“
A
“
“
“
“
“
“
“
“
"
"
79
“
“
"
“
“
“
“
B
“
“
“
“
“
“
“
“
80
“
“
H
“
“
“
“
A
“
“
“
“
“
“
“
“
“
81
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
82
“
“
“
H
“
“
“
A
“
“
“
“
“
“
83
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
“
Max
Unit
“
“
“
“
84
“
“
“
“
H
“
“
A
“
“
“
“
“
“
“
"
“
85
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
86
“
“
“
“
“
A
“
“
“
“
“
“
"
"
87
“
“
“
“
“
H
“
“
“
“
B
“
“
“
“
“
"
“
“
“
88
“
“
“
“
“
“
“
A
“
“
“
“
“
“
89
“
“
“
“
“
“
“
B
“
H
“
“
“
“
“
“
“
“
"
“
90
“
“
“
“
“
“
“
A
“
“
“
“
"
"
91
“
“
“
“
“
“
“
B
“
“
H
“
“
“
“
“
“
“
“
“
92
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
“
“
B
“
“
“
H
“
“
“
“
“
“
“
“
93
“
“
"
"
94
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
95
“
B
“
“
“
“
“
A
“
“
“
“
H
“
“
“
“
“
“
96
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
“
97
“
“
L
“
“
“
“
A
“
“
“
“
“
“
“
"
“
98
“
“
L
“
“
“
“
B
“
“
“
“
“
“
See footnotes at end of device type 03.
Min
4/
MIL-M-38510/9E
56
7
TC = 25°C
3/ 6/
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILSTD-883
method
Cases
A, B, C, D
Test No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
SIA
SIB
QA
QB
QC
QD
GND
CLK
CLR
QE
QF
QG
QH
VCC
A
“
H
“
H
“
H
“
H
“
4.5 V
“
“
“
“
“
"
Truth
3014
99
100
B
“
L
“
L
“
H
H
H
“
A
“
A
“
GND
table
“
test
"
101
“
“
“
“
L
“
“
B
A
“
5/
“
102
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
103
“
“
“
“
“
L
“
A
“
“
“
“
“
“
“
“
"
“
104
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
105
“
“
“
“
“
“
“
A
“
L
“
“
“
“
“
“
"
106
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
107
“
“
“
“
“
“
“
A
“
“
L
“
“
“
“
“
"
108
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
109
“
“
“
“
“
“
“
A
“
“
“
L
"
"
“
“
“
110
“
“
“
“
“
“
“
B
“
“
“
“
"
“
“
“
“
111
“
“
“
“
“
“
“
A
“
“
“
“
L
“
“
"
“
112
"
A
"
“
“
“
“
A
“
“
“
“
“
“
“
“
"
"
113
“
“
"
“
“
“
“
B
“
“
“
“
“
“
“
“
114
“
“
H
“
“
“
“
A
“
“
“
“
“
“
“
“
“
115
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
116
“
“
“
H
“
“
“
A
“
“
“
“
“
“
117
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
“
Max
Unit
“
“
“
“
118
“
“
“
“
H
“
“
A
“
“
“
“
“
“
“
"
“
119
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
120
“
“
“
“
“
A
“
“
“
“
“
“
"
"
121
“
“
“
“
“
H
“
“
“
“
B
“
“
“
“
“
"
“
“
“
122
“
“
“
“
“
“
“
A
“
“
“
“
“
“
123
“
“
“
“
“
“
“
B
“
H
“
“
“
“
“
“
“
“
"
“
124
“
“
“
“
“
“
“
A
“
“
“
“
"
"
125
“
“
“
“
“
“
“
B
“
“
H
“
“
“
“
“
“
“
“
“
126
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
“
“
“
B
“
“
“
H
“
“
“
“
“
“
“
“
127
“
"
"
128
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
129
B
B
“
“
“
“
“
A
“
“
“
“
H
“
“
“
“
“
“
130
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
“
131
“
“
L
“
“
“
“
A
“
“
“
“
“
“
“
"
“
132
“
“
L
“
“
“
“
B
“
“
“
“
“
“
See footnotes at end of device type 03.
Min
4/
MIL-M-38510/9E
57
7
TC = 25°C
3/ 6/
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILSTD-883
method
Cases
A, B, C, D
Test No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
SIA
SIB
QA
QB
QC
QD
GND
CLK
CLR
QE
QF
QG
QH
VCC
A
“
H
“
H
“
H
“
H
“
4.5 V
“
“
“
“
“
"
Truth
3014
133
134
B
“
L
“
L
“
H
H
H
“
A
“
B
“
GND
table
“
test
"
135
“
“
“
“
L
“
“
B
A
“
5/
“
136
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
137
“
“
“
“
“
L
“
A
“
“
“
“
“
“
“
“
"
“
138
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
139
“
“
“
“
“
“
“
A
“
L
“
“
“
“
“
“
"
140
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
141
“
“
“
“
“
“
“
A
“
“
L
“
“
“
“
“
"
142
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
143
“
“
“
“
“
“
“
A
“
“
“
L
"
"
“
“
“
144
“
“
“
“
“
“
“
B
“
“
“
“
"
“
“
“
“
145
“
“
“
“
“
“
“
A
“
“
“
“
L
“
“
"
“
146
A
A
"
“
“
“
“
A
“
“
“
“
“
“
“
“
"
"
147
“
“
"
“
“
“
“
B
“
“
“
“
“
“
“
“
148
“
“
H
“
“
“
“
A
“
“
“
“
“
“
“
“
“
149
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
"
"
150
“
“
“
H
“
“
“
A
“
“
“
“
“
“
151
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
“
“
“
152
“
“
“
“
H
“
“
A
“
“
“
“
“
“
“
"
“
153
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
“
"
154
“
“
“
“
“
A
“
“
“
“
“
“
"
"
155
“
“
“
“
“
H
“
“
“
“
B
“
“
“
“
“
"
“
“
“
156
“
“
“
“
“
“
“
A
“
“
“
“
“
“
157
“
“
“
“
“
“
“
B
“
H
“
“
“
“
“
“
“
“
"
“
158
“
“
“
“
“
“
“
A
“
“
“
“
"
"
159
“
“
“
“
“
“
“
B
“
“
H
“
“
“
“
“
“
“
“
“
160
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
“
“
“
B
“
“
“
H
“
“
“
“
“
H
L
“
“
“
161
“
"
"
162
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
163
"
"
L
L
L
L
“
A
B
L
L
L
8
Repeat subgroup 7 at TC = +125° C and TC = -55° C.
See footnotes at end of device type 03.
Max
Unit
“
“
“
Min
“
4/
MIL-M-38510/9E
58
7
TC = 25°C
3/ 6/
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILSTD-883
method
Cases
A, B, C, D
Test No.
1
2
SIA
SIB
IN
IN
3
QA
4
QB
5
QC
6
QD
7
8
9
10
11
12
13
14
Test limits
QH
VCC
Meas.
terminal
OUT
5.0 V
QH
11
“
QA
12
49
ns
"
“
QB
"
"
“
"
"
“
QC
"
"
“
“
"
"
“
QD
"
"
“
“
QE
"
"
“
“
QF
"
"
“
“
QG
"
"
“
“
QH
"
"
“
"
GND
CLK
CLR
GND
IN
4.5 V
“
GND
IN
“
"
“
QE
QF
QG
Min
Max
Unit
fMAX
(Fig 6)
164
tPHL1
3003
165
“
“
(Fig 6)
166
“
“
“
167
“
“
“
168
”
“
“
169
“
"
"
“
“
“
170
“
"
"
’‘
“
“
171
“
"
"
’‘
“
“
172
“
"
"
"
tPLH2
"
173
IN
IN
“
IN
4.5 V
“
QA
10
30
“
“
"
174
"
"
“
"
"
“
QB
"
"
“
“
“
“
175
"
"
“
"
"
“
QC
"
"
“
“
“
176
"
"
“
"
"
“
“
”
“
“
177
"
"
“
"
"
“
“
“
178
"
"
“
"
"
’‘
’‘
“
“
179
"
"
“
"
"
“
“
180
"
"
“
"
"
"
181
"
"
“
"
"
“
tPHL2
“
"
182
"
"
“
"
"
“
QB
"
"
“
“
“
“
183
"
"
“
"
"
“
QC
"
"
“
“
“
“
184
"
"
“
"
"
“
”
“
“
185
"
"
“
"
"
“
“
“
186
"
"
“
"
"
’‘
“
“
187
"
"
“
"
"
’‘
“
“
188
"
"
“
"
"
OUT
IN
IN
OUT
"
10
fMAX
(Fig 6)
189
TC = 125°C
tPHL1
3003
190
“
“
(Fig 6)
191
“
“
“
192
“
“
“
193
”
“
“
“
“
’‘
’‘
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MHz
“
QD
"
"
“
QE
"
"
“
“
QF
"
"
“
“
QG
"
"
“
“
QH
"
"
“
“
QA
"
37
"
“
QD
"
"
“
QE
"
"
“
“
QF
"
"
“
“
QG
"
"
“
“
QH
"
"
“
"
"
"
"
QH
9
“
GND
IN
“
QA
12
63
ns
“
"
"
“
QB
"
"
“
“
"
"
“
QC
"
"
“
“
"
"
“
QD
"
"
“
194
“
"
"
“
QE
"
"
“
“
195
“
"
"
“
QF
"
"
“
“
“
196
“
"
"
“
QG
"
"
“
“
“
197
“
"
"
“
QH
"
"
“
See footnotes at end of device type 03.
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MHz
MIL-M-38510/9E
59
9
TC = 25°C
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
Subgroup
Symbol
MILSTD-883
method
Cases
A, B, C, D
Test No.
1
2
3
SIA
SIB
QA
OUT
4
QB
5
QC
6
QD
7
8
9
Unit
4.5 V
5.0 V
QA
10
42
ns
"
“
QB
"
"
“
“
"
"
“
QC
"
"
“
“
"
"
“
QD
"
"
“
“
"
"
“
QE
"
"
“
“
“
200
"
"
“
“
“
201
"
"
”
“
“
202
"
"
“
“
“
203
"
"
“
"
"
’‘
“
“
204
"
"
“
"
"
“
"
"
“
"
"
“
"
"
“
"
"
“
"
"
“
"
"
60
’‘
“
“
205
"
"
"
tPHL2
"
206
"
"
“
“
"
207
"
"
“
“
“
208
"
"
“
“
“
209
"
"
”
“
“
210
"
"
“
’‘
“
“
211
"
"
“
"
"
“
“
212
"
"
“
"
"
’‘
“
“
213
"
"
“
"
"
QE
QF
QG
QH
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
“
QF
"
"
“
“
QG
"
"
“
“
QH
"
"
“
“
QA
"
52
"
“
QB
"
"
“
“
QC
"
"
“
“
QD
"
"
“
QE
"
"
“
“
“
QF
"
"
“
“
QG
"
"
“
QH
"
"
“
“
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
A = normal clock pulse, except for subgroups 7 and 8 (see 3/).
B = momentary GND, then 4.5 V to clear register prior to test, except for subgroups 7 and 8 (see 3/).
For subgroups 7 and 8, A = VCC and B = GND.
Output voltages shall be either:
(a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or
(b) H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
5/ The tests in subgroups 7 and 8 shall be performed in the sequence specified.
6/ Only a summary of attributes data is required.
7/ For schematics incorporating 4.5 kΩ base resistors, the minimum and maximum limits shall be -0.6 and -1.5 mA, respectively.
For schematics incorporating 6 kΩ base resistors, the minimum and maximum limits shall be -0.4 and -1.3 mA, respectively.
8/ For device type 03, schematic circuits A, D, E and F, the minimum and maximum limits shall be -0.7 and -1.6 mA, respectively.
For schematic circuit B, the minimum and maximum limits shall be -0.8 and -2.6 mA, respectively.
For schematic circuit C, the minimum and maximum limits shall be -0.6 and -1.5 mA, respectively.
9/ For device type 03, schematics circuits A, C, D, E and F, the maximum limits shall be 40 µA. For schematic circuit B, the maximum limits shall be 80 µA.
10/ For device type 03, schematics circuits A, C, D, E and F, the maximum limits shall be 100 µA. For schematic circuit B, the maximum limits shall be 200 µA.
1/
2/
3/
4/
MIL-M-38510/9E
"
11
Max
"
IN
"
OUT
VCC
Min
IN
IN
199
OUT
Test limits
Meas.
terminal
“
198
(Fig 6)
OUT
14
GND
3003
“
OUT
13
CLR
tPLH2
OUT
12
CLK
10
OUT
11
GND
TC = 125°C
“
OUT
10
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Cases E, F
1
VOH
STD-883
method
3006
TC = 25°C
VOH
3006
2
“
VOL
3007
VOL
3007
“
Symbol
1
2
3
4
5
6
7
QH
8
2.4
QH
0.4
“
"
QH
0.4
“
"
"
S/L
-1.5
“
"
"
CLK
"
“
"
SI
“
“
"
CLKI
“
“
"
4
"
0.8 V
-12 mA
"
VIC
"
“
“
7
"
’‘
8
"
“
“
“
9
"
“
"
10
"
“
"
11
"
“
“
12
“
“
13
“
“
14
“
“
"
15
"
“
IIL1
3009
17
“
IIL2
“
18
“
“
“
19
4.5 V
"
“
"
"
20
GND
"
QH
SI
A
B
C
-12 mA
-12 mA
16
-12 mA
61
0.4 V
4.5 V
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
“
“
B
"
"
C
"
“
“
"
“
"
“
"
"
F
"
“
"
"
G
"
"
"
“
“
21
"
"
“
22
"
"
“
“
“
23
"
“
“
“
24
"
“
“
“
25
"
“
“
26
"
“
“
"
27
"
“
IIL3
“
28
4.5 V
See footnotes at end of device type 04.
A
E
“
"
0.4 V
"
"
D
“
0.4 V
“
"
“
0.4 V
Unit
V
"
"
0.4 V
-12 mA
Max
"
"
0.4 V
CLKI
16 mA
"
-12 mA
D
-.8 mA
4.5 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
"
H
"
"
5.5 V
S/L
-1.2
-3.9
mA
"
SI
-0.4
-1.3
“
"
CLKI
"
"
“
"
A
"
"
"
"
B
"
“
“
"
C
"
“
“
"
D
"
“
“
"
"
E
"
"
“
"
"
F
"
"
“
"
"
G
"
"
“
"
"
H
"
"
“
"
"
CLK
6/
"
MIL-M-38510/9E
”
-12 mA
Test limits
QH
16 mA
6
16
"
2.0 V
5
“
15
"
"
G
14
Min
2.4
3
F
13
QH
-.8 mA
E
12
VCC
"
CLK
11
4.5 V
GND
GND
"
S/L
0.8 V
10
Meas.
terminal
H
2.0 V
0.8 V
Test No.
1
9
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
1
Cases E, F
1
2
3
4
5
6
7
8
IIH1
STD-883
method
3010
Test No.
29
TC = 25°C
“
“
30
GND
"
“
“
“
31
5.5 V
"
“
“
“
32
"
"
“
“
“
33
"
"
“
“
“
34
"
“
“
“
35
"
“
“
“
36
"
“
“
“
37
"
“
“
“
38
"
GND
S/L
CLK
E
F
G
H
QH
9
QH
GND
GND
10
SI
2.4 V
11
A
12
B
13
C
2.4 V
2.4 V
2.4 V
2.4 V
D
15
CLKI
2.4 V
2.4 V
2.4 V
2.4 V
"
2.4 V
14
Max
40
Unit
µA
CLKI
"
“
A
“
“
"
B
“
“
"
C
“
“
"
“
E
"
“
"
"
F
“
“
"
"
G
“
“
"
"
H
"
“
39
40
"
“
“
41
GND
"
“
“
“
42
5.5 V
"
“
“
“
43
"
"
“
“
“
44
"
"
“
“
“
45
"
“
“
“
46
"
“
“
“
47
"
“
“
“
48
"
“
“
“
49
"
"
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
5.5 V
"
CLK
"
"
SI
100
“
"
"
CLKI
"
“
"
A
“
“
"
B
“
“
"
C
“
“
"
D
"
“
"
"
E
"
“
"
"
F
“
“
"
"
G
“
“
"
"
H
"
“
“
“
“
50
GND
5.5 V
"
"
CLK
"
“
“
IIH3
“
51
2.4 V
GND
"
GND
"
S/L
120
“
“
IIH4
“
52
5.5 V
GND
"
GND
"
S/L
300
“
“
IOS
3011
53
C 1/
4.5 V
4.5 V
4.5 V
"
QH
-20
-55
mA
“
IOS
3011
54
C 1/
4.5 V
GND
4.5 V
"
QH
-20
-55
mA
ICC
3005
55
C 1/
4.5 V
VCC
63
mA
“
4.5 V
4.5 V
4.5 V
"
GND
4.5 V
GND
"
"
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = +125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55°C and VI C tests are omitted.
GND
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
7
Truth
3014
56
B
B
B
B
B
B
H
GND
L
A
B
B
B
B
B
4.5 V
TC = 25°C
table
“
57
A
B
B
B
B
B
"
"
"
"
B
B
B
B
"
"
2/ 5/
test
“
58
"
A
A
A
A
A
"
"
"
"
A
A
A
A
"
"
“
4/
“
59
"
B
A
A
A
A
"
"
"
"
A
A
A
A
"
"
See footnotes at end of device type 04.
3/
MIL-M-38510/9E
62
“
"
5.5 V
"
Min
D
“
5.5 V
"
VCC
"
IIH2
5.5 V
5.5 V
"
“
5.5 V
Test limits
Meas.
terminal
SI
"
"
"
2.4 V
16
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSTD-883
method
3014
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Subgroup
Symbol
7
Truth
TC = 25°C
2/ 5/
table
“
61
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
test
“
62
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Test No.
60
S/L
A
CLK
A
E
A
F
A
G
A
H
A
QH
H
GND
GND
QH
L
SI
A
A
A
B
A
C
A
D
A
CLKI
B
VCC
Min
Max
Unit
4.5 V
“
4/
“
63
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
64
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
65
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
66
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
67
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
68
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
69
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
70
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
71
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
72
"
A
"
"
"
"
L
"
H
A
"
"
"
"
"
"
"
“
73
"
B
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
"
“
74
"
A
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
75
"
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
“
76
"
A
"
"
"
"
"
"
"
A
"
"
"
"
"
"
“
"
“
77
"
B
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
78
"
A
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
79
"
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
“
80
"
A
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
“
81
"
B
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
"
“
82
"
A
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
83
"
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
“
84
"
A
"
"
"
"
"
"
"
A
"
"
"
"
"
"
“
"
“
85
"
B
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
86
"
A
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
87
"
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
“
"
“
88
"
A
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
"
“
89
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
90
"
A
"
"
"
"
"
"
"
"
"
"
"
"
A
"
“
"
“
91
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
92
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
93
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
94
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3/
MIL-M-38510/9E
63
“
"
"
See footnotes at end of device type 04.
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSTD-883
method
3014
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Subgroup
Symbol
7
Truth
TC = 25°C
2/ 5/
table
“
96
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
test
“
97
"
B
"
"
"
"
L
"
H
A
"
"
"
"
"
"
Test No.
95
S/L
A
CLK
B
E
A
F
A
G
A
H
A
QH
H
GND
GND
QH
L
SI
B
A
A
B
A
C
A
D
A
CLKI
B
VCC
Min
Max
Unit
4.5 V
“
4/
“
98
"
A
"
"
"
"
H
"
L
A
"
"
"
"
"
"
"
"
“
99
"
B
"
"
"
"
H
"
L
B
"
"
"
"
"
"
"
"
“
100
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
“
"
“
101
"
B
"
"
"
"
L
"
H
A
"
"
"
"
"
"
"
"
“
102
"
A
"
"
"
"
H
"
L
A
"
"
"
"
"
"
"
"
“
103
"
B
"
"
"
"
H
"
L
B
"
"
"
"
"
"
"
"
“
104
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
"
"
“
105
"
B
"
"
"
"
L
"
H
A
"
"
"
"
"
"
"
“
106
"
A
"
"
"
"
H
"
L
A
"
"
"
"
"
"
"
“
107
"
B
"
"
"
"
H
"
L
B
"
"
"
"
"
"
"
“
"
“
108
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
"
“
109
B
B
"
B
"
B
H
"
L
A
"
B
"
B
"
"
"
"
“
110
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
111
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
112
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
113
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
114
"
A
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
“
115
A
A
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
“
116
"
B
"
"
"
"
"
"
"
B
"
"
"
"
B
"
“
"
“
117
"
A
"
A
"
A
L
"
H
B
"
A
"
A
"
"
"
"
“
118
"
B
"
"
"
"
L
"
H
A
"
"
"
"
"
"
"
"
“
119
"
A
"
"
"
"
H
"
L
A
"
"
"
"
"
"
“
"
“
120
"
B
"
"
"
"
H
"
L
B
"
"
"
"
"
"
"
"
“
121
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
"
"
“
122
"
B
"
"
"
"
L
"
H
A
"
"
"
"
"
"
“
"
“
123
"
A
"
"
"
"
H
"
L
A
"
"
"
"
"
"
"
"
“
124
"
B
"
"
"
"
H
"
L
B
"
"
"
"
"
"
"
"
“
125
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
“
"
“
126
"
B
"
"
"
"
L
"
H
A
"
"
"
"
"
"
“
"
“
127
"
A
"
"
"
"
H
"
L
A
"
"
"
"
"
"
"
"
“
128
"
B
"
"
"
"
H
"
L
B
"
"
"
"
"
"
“
"
“
129
"
A
"
"
"
"
L
"
H
B
"
"
"
"
"
"
3/
MIL-M-38510/9E
64
“
"
See footnotes at end of device type 04.
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSTD-883
method
3014
Cases E, F
1
2
3
4
Subgroup
Symbol
7
Truth
TC = 25°C
2/ 5/
table
“
131
"
A
A
"
test
“
132
B
B
B
"
“
4/
“
133
"
A
"
"
"
"
“
134
"
B
"
"
"
“
135
"
A
"
“
"
“
136
"
B
Test No.
130
S/L
A
CLK
B
5
6
7
8
9
10
11
H
A
QH
A
"
H
"
L
"
"
B
"
L
"
H
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
E
A
F
A
G
A
L
GND
GND
QH
H
SI
A
A
A
12
B
A
13
14
15
16
VCC
C
A
D
A
CLKI
B
4.5 V
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
137
"
A
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
“
138
A
A
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
“
139
"
B
"
"
"
"
"
"
"
B
"
"
"
"
B
"
"
"
“
140
"
A
A
"
A
"
H
"
L
"
A
"
A
"
"
"
"
65
“
"
“
141
"
B
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
"
“
142
"
A
"
"
"
"
L
"
H
"
"
"
"
"
"
"
"
“
143
"
B
"
"
"
"
L
"
H
"
"
"
"
"
"
"
"
“
144
"
A
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
“
145
"
B
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
"
“
146
"
A
"
"
"
"
L
"
H
"
"
"
"
"
"
"
“
"
“
147
"
B
"
"
"
"
L
"
H
"
"
"
"
"
"
"
"
"
“
148
"
A
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
"
“
149
"
B
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
"
“
150
"
A
"
"
"
"
L
"
H
"
"
"
"
"
"
"
"
"
“
151
"
B
"
"
"
"
L
"
H
"
"
"
"
"
"
"
“
"
“
152
"
A
"
"
"
"
H
"
L
"
"
"
"
"
"
"
"
"
“
153
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
154
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
155
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
156
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
157
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
158
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
159
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
160
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
161
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
162
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
163
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
164
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
See footnotes at end of device type 04.
Min
Max
Unit
3/
MIL-M-38510/9E
“
"
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
7
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Truth
STD-883
method
3014
Test No.
165
S/L
A
CLK
B
TC = 25°C
2/ 5/
table
“
166
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
test
“
167
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
E
A
F
A
G
A
H
A
QH
H
GND
GND
QH
L
SI
A
A
A
B
A
C
A
D
A
CLKI
B
VCC
Test limits
Meas.
terminal
Min
Max
Unit
4.5 V
“
4/
“
168
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
169
B
B
"
"
"
"
L
"
H
"
"
"
"
"
"
"
"
"
“
170
A
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
171
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
172
"
B
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
“
173
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
174
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
175
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3/
"
“
176
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
177
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
178
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
179
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
180
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
181
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
“
182
"
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
183
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
184
B
"
"
"
"
B
H
"
L
"
"
"
"
"
"
"
"
"
“
185
A
"
"
"
"
B
H
"
L
"
"
"
"
"
"
"
"
"
“
186
B
"
"
"
B
A
L
"
H
"
"
"
"
"
"
"
“
"
“
187
A
"
"
"
B
A
L
"
H
"
"
"
"
"
"
"
IN
GND
GND
GND
GND
GND
5.0 V
QH
18
GND
GND
GND
GND
GND
"
S/L to QH
6
35
ns
GND
GND
GND
GND
GND
"
S/L to Q H
7
44
"
IN
IN
"
CLK to QH
5
28
"
IN
IN
"
35
"
8
MIL-M-38510/9E
66
“
"
Repeat subgroup 7 at TC = +125° C and TC = -55° C.
9
fMAX
(Fig 7)
188
IN
IN
GND
GND
GND
GND
GND
OUT
TC = 25°C
tPLH1
3003
189
IN
GND
GND
GND
GND
IN
"
OUT
"
tPHL1
(Fig 7)
190
IN
GND
GND
GND
GND
IN
“
tPLH2
“
191
5.0 V
IN
"
tPHL2
“
192
5.0 V
IN
CLK to Q H
6
"
tPLH3
“
193
GND
GND
GND
GND
GND
IN
"
OUT
GND
GND
GND
GND
GND
GND
"
H to QH
5
21
"
“
tPHL3
“
194
"
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
H to QH
7
40
"
"
tPLH4
“
195
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
"
H to Q H
6
31
"
"
tPHL4
“
196
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
"
H to Q H
6
31
"
See footnotes at end of device type 04.
OUT
"
"
OUT
OUT
"
MHz
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
Cases E, F
1
2
10
fMAX
STD-883
method
(Fig 7)
TC = 125°C
tPLH1
3003
"
tPHL1
(Fig 7)
199
IN
GND
“
tPLH2
“
200
5.0 V
IN
"
tPHL2
“
201
5.0 V
IN
"
tPLH3
“
202
GND
GND
3
4
5
6
Test No.
197
S/L
IN
CLK
IN
E
GND
F
GND
G
GND
H
GND
198
IN
GND
GND
GND
GND
IN
GND
GND
GND
IN
7
QH
OUT
8
OUT
GND
GND
IN
QH
GND
GND
OUT
"
OUT
10
SI
IN
"
"
GND
9
OUT
IN
"
OUT
GND
"
OUT
"
11
12
13
14
15
16
Test limits
A
GND
B
GND
C
GND
D
GND
CLKI
GND
VCC
Meas.
terminal
QH
Min
14
Max
5.0 V
Unit
MHz
GND
GND
GND
GND
GND
"
S/L to QH
10
40
ns
GND
GND
GND
GND
GND
"
S/L to Q H
11
60
"
IN
"
CLK to QH
6
37
"
IN
"
CLK to Q H
10
47
"
GND
"
H to QH
5
27
"
IN
GND
GND
GND
GND
“
tPHL3
“
203
"
"
"
"
"
"
"
"
"
"
"
"
"
H to QH
11
54
"
"
tPLH4
“
204
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
"
H to Q H
10
41
"
tPHL4
“
205
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
"
H to Q H
10
41
"
"
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55° C.
67
MIL-M-38510/9E
1/ C = after all other input conditions, but prior to measurement, apply momentary GND, then 4.5 V.
2/ For subgroups 7 and 8, A = VCC and B = GND.
3/ Output voltages shall be either:
(a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or
(b) H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ The tests in subgroups 7 and 8 shall be performed in the sequence specified.
5/ Only a summary of attributes data is required.
6/ For device type 04, schematics incorporating a 4 kΩ base resistor in the clock input circuit, the minimum and maximum limits shall be -0.7 and -1.6 mA, respectively.
For schematics incorporating a 6 kΩ base resistor in the clock input circuit, the minimum and maximum limits shall be -0.4 and -1.3 mA, respectively.
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
1
VOH
STD-883
method
3006
TC = 25°C
“
"
"
Cases E, F
1
Test No.
1
CLR
2.0 V
3006
2
"
3
2
SR
3
4
5
6
A
2.0 V
B
2.0 V
C
2.0 V
D
2.0 V
"
"
"
"
"
"
"
"
7
SL
8
9
10
11
GND
GND
S0
2.0 V
S1
2.0 V
CLK
A 1/
"
"
"
"
"
"
"
"
"
"
"
"
4
“
VOL
3007
5
"
"
"
0.8 V
"
0.8 V
"
0.8 V
"
0.8 V
"
"
"
"
"
"
"
"
”
"
"
6
"
"
"
"
"
"
"
"
"
“
“
"
7
"
"
"
"
"
"
"
"
"
’‘
“
"
8
"
"
"
"
"
"
"
"
"
“
VIC
9
-12 mA
“
"
10
“
"
11
“
“
12
“
“
13
“
“
14
“
“
"
15
"
"
16
"
17
"
“
“
"
“
IIL1
3009
19
“
"
"
20
“
“
“
21
“
“
“
22
“
“
“
23
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
18
“
“
“
24
“
“
“
25
“
IIL2
“
26
“
IIL2
"
27
“
IIL3
“
28
0.4 V
0.4 V
0.4 V
0.4 V
See footnotes at end of device type 05.
VCC
-0.8 mA 4.5 V
-0.8 mA
-0.8 mA
-0.8 mA
16 mA
16 mA
16 mA
16 mA
Test limits
Meas.
terminal
QA
Min
2.4
Max
Unit
V
"
QB
"
“
"
QC
"
“
"
“
"
QD
"
QA
0.4
“
"
QB
"
“
"
QC
“
“
"
QD
“
“
"
CLR
-1.5
“
SR
"
"
"
A
"
“
“
"
"
B
"
“
"
"
C
"
“
"
"
D
"
“
"
"
SL
"
"
-12 mA
-12 mA
-12 mA
"
S0
"
"
"
S1
"
"
"
CLK
5.5 V
CLR
-0.4
"
“
-1.3
mA
GND
"
SR
"
"
"
"
5.5 V
5.5 V
"
A
"
“
“
"
"
"
"
B
"
“
“
"
"
"
"
C
"
“
“
“
"
"
"
"
D
"
"
"
GND
"
"
SL
"
"
“
"
0.4 V
"
SO
"
7/
“
"
5.5 V
QA
16
"
"
0.4 V
QB
15
"
"
0.4 V
QC
14
"
"
0.4 V
QD
13
"
0.4 V
0.4 V
"
S1
"
7/
“
"
CLK
-0.7
-1.6
"
MIL-M-38510/9E
68
“
12
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
1
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
5.5 V
IIH1
Test No.
29
TC = 25°C
“
"
"
30
"
"
31
“
“
"
32
“
“
"
33
“
“
"
34
“
"
"
35
"
5.5 V
“
"
"
"
36
"
2.4 V
"
37
"
"
“
"
"
38
IIH2
"
39
"
"
"
40
“
"
"
41
“
“
"
42
“
“
“
"
43
“
"
44
“
"
"
45
“
"
"
"
"
“
SR
A
B
C
D
SL
2.4 V
GND
GND
S0
"
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
S1
QC
QB
QA
5.5 V
5.5 V
Max
40
Unit
µA
“
"
SR
"
GND
"
A
"
“
"
"
"
"
B
"
“
"
"
"
"
C
"
“
"
"
"
"
D
"
“
"
SL
"
"
"
S0
"
"
S1
"
"
2.4 V
2.4 V
"
5.5 V
Min
5.5 V
"
5.5 V
VCC
GND
5.5 V
"
CLK
"
“
"
CLR
100
"
SR
"
"
“
"
GND
GND
"
A
"
"
"
"
"
B
"
“
“
“
"
"
"
"
C
"
"
"
"
"
D
"
“
"
5.5 V
"
SL
"
"
46
"
5.5 V
47
"
5.5 V
5.5 V
5.5 V
“
"
"
48
“
3011
49
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
5.5 V
5.5 V
A
“
IOS
"
"
50
"
"
"
"
"
"
"
"
"
“
“
“
51
"
"
"
"
"
"
"
"
"
“
“
“
52
"
"
"
"
"
"
"
"
"
ICC
3005
53
"
GND
GND
GND
GND
"
"
"
"
“
QD
"
"
5.5 V
CLK
"
5.5 V
5.5 V
2
Same tests, terminal conditions, and limits as subgroup 1 except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions, and limits as subgroup 1 except TC = -55°C and VIC tests are omitted.
5.5 V
GND
GND
GND
GND
"
S0
"
"
"
S1
"
"
"
CLK
"
“
"
QA
-20
-57
mA
"
QB
"
"
"
"
QC
"
“
“
"
QD
"
“
“
63
“
"
7
Truth
3014
54
B 2/
B 2/
A 1/
B 2/
A 1/
B 2/
B 2/
GND
A 1/
A 1/
A 1/
L
L
L
L
TC = 25°C
table
"
55
"
"
"
"
"
"
A
"
L
"
L
"
56
"
"
"
"
"
"
"
test
"
"
"
3/ 6/
A
"
"
"
"
B
"
L
"
L
"
“
5/
"
57
"
"
"
"
"
"
"
"
"
"
A
"
H
"
H
"
“
"
"
"
58
"
"
B
A
B
A
"
"
"
"
A
"
H
"
H
"
“
"
59
"
"
B
"
B
"
"
"
"
"
B
"
H
"
H
"
“
"
"
60
"
"
B
"
B
"
"
"
"
"
A
H
L
H
L
"
See footnotes at end of device type 05.
VCC
5.0 V
4/
MIL-M-38510/9E
69
“
"
CLR
2.4 V
Test limits
Meas.
terminal
CLR
STD-883
method
3010
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MIL-
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
7
Truth
TC = 25°C
3/ 6/
table
"
62
"
"
"
"
"
"
"
"
"
"
B
"
L
"
L
"
test
"
63
"
"
"
"
"
"
"
"
"
"
A
"
H
"
H
"
“
5/
"
64
"
"
"
"
"
"
"
"
B
B
A
"
"
"
"
"
“
"
"
"
65
"
"
"
B
"
B
"
"
"
"
A
"
"
"
"
"
“
"
66
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
“
"
"
67
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
“
"
"
"
68
B
"
"
"
"
"
"
"
"
"
"
L
L
L
L
"
"
69
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
70
"
"
"
A
"
"
A
"
"
"
"
"
"
"
"
"
“
"
71
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
“
"
"
72
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
“
"
73
"
"
"
"
"
"
"
"
A
"
A
"
"
"
"
"
“
"
"
"
74
"
A
B
B
B
"
B
"
"
"
A
"
"
"
"
"
“
“
"
"
"
75
"
A
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
76
"
A
"
"
"
"
"
"
"
"
A
"
"
"
H
"
“
"
"
77
"
B
"
"
"
"
"
"
"
"
A
"
"
"
H
"
“
"
"
"
78
"
B
"
"
"
"
"
"
"
"
B
"
"
"
H
"
"
79
"
B
"
"
"
"
"
"
"
"
A
"
"
H
L
"
“
70
“
“
Test No.
61
CLR
A
SR
B
A
A
B
A
C
A
D
A
SL
B
GND
GND
S0
A
S1
A
CLK
A
QD
QC
QB
QA
VCC
H
L
H
L
5.0 V
"
80
"
A
"
"
"
"
"
"
"
"
A
"
"
H
L
"
“
"
"
"
81
"
A
"
"
"
"
"
"
"
"
B
"
"
H
L
"
“
"
"
82
"
A
"
"
"
"
"
"
"
"
A
"
H
L
H
"
“
"
"
"
83
"
B
"
"
"
"
"
"
"
"
A
"
H
L
H
"
"
84
"
B
"
"
"
"
"
"
"
"
B
"
H
L
H
"
"
"
"
85
"
B
"
"
"
"
"
"
"
"
A
H
L
H
L
"
“
"
86
"
A
"
"
"
"
"
"
"
"
A
H
L
H
L
"
“
"
"
87
"
A
"
"
"
"
"
"
"
"
B
H
L
H
L
"
“
"
"
"
88
"
A
"
"
"
"
"
"
"
"
A
L
H
L
H
"
"
89
"
B
"
"
"
"
"
"
"
"
A
L
H
L
H
"
"
"
"
90
"
"
"
"
"
"
"
"
"
"
B
L
H
L
H
"
"
91
"
"
"
"
"
"
"
"
"
"
A
H
L
H
L
"
"
"
"
92
"
"
"
"
"
"
"
"
"
"
B
H
L
H
"
"
“
"
93
"
"
"
"
"
"
"
"
"
"
A
L
H
L
"
"
“
"
"
94
"
"
"
"
"
"
"
"
"
"
B
L
H
"
"
"
“
“
“
“
“
“
See footnotes at end of device type 05.
Test limits
Meas.
terminal
Min
Max
Unit
4/
MIL-M-38510/9E
Symbol
“
STD-883
method
3014
Cases E, F
Subgroup
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MIL-
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Symbol
7
Truth
TC = 25°C
3/ 6/
table
"
96
"
"
"
"
"
"
"
"
"
test
"
97
"
"
"
"
"
"
"
"
"
“
5/
"
98
"
"
"
"
"
"
"
"
B
“
"
"
"
99
"
"
"
"
"
"
A
"
“
"
100
"
"
"
"
"
"
A
"
“
"
"
101
"
"
"
"
"
"
A
"
“
"
"
"
102
"
"
"
"
"
"
B
"
"
"
A
H
"
"
"
"
"
103
"
"
"
"
"
"
B
"
"
"
B
H
"
"
"
"
"
"
"
104
"
"
"
"
"
"
B
"
"
"
A
L
H
"
"
"
"
105
"
"
"
"
"
"
A
"
"
"
A
L
H
"
"
"
“
“
“
STD-883
method
3014
Cases E, F
Subgroup
Test No.
95
CLR
A
SR
B
A
B
B
B
C
B
D
B
SL
B
GND
GND
CLK
A
QD
QC
QB
QA
VCC
H
L
L
L
5.0 V
"
B
H
"
"
"
"
"
A
L
"
"
"
"
A
A
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
A
H
"
"
"
"
S0
A
S1
B
“
"
"
106
"
"
"
"
"
"
A
"
"
"
B
L
H
"
"
"
“
"
"
"
107
"
"
"
"
"
"
A
"
"
"
A
H
L
H
"
"
"
“
“
71
108
"
"
"
"
"
"
B
"
"
"
A
H
L
H
"
"
109
"
"
"
"
"
"
B
"
"
"
B
H
L
H
"
"
“
"
110
"
"
"
"
"
"
B
"
"
"
A
L
H
L
H
"
“
"
"
111
"
"
"
"
"
"
A
"
"
"
A
L
H
L
H
"
“
"
"
"
112
"
"
"
"
"
"
A
"
"
"
B
L
H
L
H
"
"
113
"
"
"
"
"
"
A
"
"
"
A
H
L
H
L
"
"
"
"
114
"
"
"
"
"
"
B
"
"
"
A
H
L
H
L
"
“
"
115
"
"
"
"
"
"
"
"
"
"
B
H
L
H
L
"
“
"
"
116
"
"
"
"
"
"
"
"
"
"
A
L
H
L
H
"
“
"
"
"
117
"
"
"
"
"
"
"
"
"
"
B
"
H
L
H
"
"
"
“
“
“
118
"
"
"
"
"
"
"
"
"
"
A
"
L
H
L
"
119
"
"
"
"
"
"
"
"
"
"
B
"
"
H
L
"
“
"
"
"
120
"
"
"
"
"
"
"
"
"
"
A
"
"
L
H
"
“
"
"
121
"
"
"
"
"
"
"
"
"
"
B
"
"
"
H
"
“
"
"
"
122
"
"
"
"
"
"
"
"
"
"
A
"
"
"
L
"
"
123
B
"
"
"
"
"
"
"
"
B
B
"
"
"
L
"
“
“
8
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
See footnotes at end of device type 05.
Min
Max
Unit
4/
MIL-M-38510/9E
"
"
"
Test limits
Meas.
terminal
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
9
Symbol STD-883
method
(Fig 8)
fMAX
Cases E, F
1
Test No.
124
CLR
B
2
SR
IN
3
4
5
6
A
GND
B
GND
C
GND
D
GND
7
SL
GND
8
9
10
11
GND
GND
S0
5.0 V
S1
GND
CLK
IN
TC = 25°C
tPHL1
3003
125
IN
5.0 V
5.0 V
5.0 V
5.0 V
"
"
5.0 V
"
"
"
(Fig 8)
126
"
"
"
"
"
"
"
"
"
“
"
"
127
"
"
"
"
"
"
"
"
"
“
"
"
128
"
"
"
"
"
"
"
"
"
"
tPLH2
"
"
129
B
IN
"
"
"
"
"
"
"
"
130
"
5.0 V
IN
"
"
"
"
"
"
"
72
"
"
131
"
5.0 V
5.0 V
IN
"
"
"
"
"
“
"
"
132
"
5.0 V
5.0 V
5.0 V
IN
"
"
"
"
"
tPHL2
"
133
5.0 V
IN
5.0 V
5.0 V
5.0 V
"
"
"
"
"
"
"
134
"
5.0 V
IN
5.0 V
5.0 V
"
"
"
"
“
"
"
135
"
5.0 V
5.0 V
IN
5.0 V
"
"
"
"
“
"
"
136
"
5.0 V
5.0 V
5.0 V
IN
"
"
"
"
10
fMAX
(Fig 8)
137
B
GND
GND
GND
GND
"
5.0 V
GND
IN
TC = 125°C
tPHL1
3003
138
IN
5.0 V
5.0 V
5.0 V
5.0 V
"
"
5.0 V
"
"
"
(Fig 8)
139
"
"
"
"
"
"
"
"
"
“
"
"
140
"
"
"
"
"
"
"
"
"
“
"
"
141
"
"
"
"
"
"
"
"
"
"
tPLH2
"
142
B
IN
"
"
"
"
"
"
"
"
"
"
143
"
5.0 V
IN
"
"
"
"
"
"
GND
“
"
"
144
"
5.0 V
5.0 V
IN
"
"
"
"
"
“
"
"
145
"
5.0 V
5.0 V
5.0 V
IN
"
"
"
"
"
tPHL2
"
146
5.0 V
IN
5.0 V
5.0 V
5.0 V
"
"
"
"
"
"
"
147
"
5.0 V
IN
5.0 V
5.0 V
"
"
"
"
“
"
"
148
"
5.0 V
5.0 V
IN
5.0 V
"
"
"
"
“
"
"
149
"
5.0 V
5.0 V
5.0 V
IN
"
"
"
"
11
1/
2/
3/
4/
IN
QD
13
QC
14
QB
15
QA
VCC
5.0 V
QA
Min
11
Max
OUT
Unit
MHz
OUT
"
CLR to QA
7
34
ns
"
CLR to QB
"
"
"
"
CLR to QC
"
"
"
"
CLR to QD
"
"
"
"
CLK to QA
"
26
"
"
CLK to QB
"
"
"
OUT
OUT
OUT
OUT
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
"
CLK to QA
"
32
"
"
CLK to QB
"
"
"
"
CLK to QC
"
"
"
"
CLK to QD
"
"
OUT
"
QA
9
OUT
"
CLR to QA
7
48
"
CLR to QB
"
"
ns
"
"
CLR to QC
"
"
"
"
CLR to QD
"
"
"
"
CLK to QA
"
36
"
"
CLK to QB
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
Test limits
Meas.
terminal
OUT
OUT
16
"
MHz
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
"
CLK to QA
"
44
"
"
CLK to QB
"
"
"
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
Same tests, terminal conditions and limits as subgroup 10, except TC = -55°C.
A = normal clock pulse, except for subgroup 7 and 8 (see 3/).
B = momentary GND, then VIN (except for subgroups 7 and 8). For subgroups 1, 2 and 3, VIN = VCC; for subgroups 9, 10 and 11, VIN = 3.0 V minimum (see figure 8).
For subgroups 7 and 8, A = VCC and B = GND.
Output voltages shall be either:
(a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or
(b) H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
5/ The tests in subgroups 7 and 8 shall be performed in the sequence specified.
6/ Only a summary of attributes data is required.
7/ For device type 05, schematic circuits A and B, the minimum and maximum limits shall be -0.4 and -1.3 mA, respectively. For schematic C, the minimum and maximum
limits shall be -0.7 and -1.6 mA, respectively.
MIL-M-38510/9E
“
12
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
STD-883
method
Test limits
Meas.
Test No.
CLR
J
K
A
B
C
D
GND
SL
CLK
1
VOH
3006
1
2.0 V
2.0 V
2.0 V
2.0 V
2.0 V
GND
0.8 V
A 1/
TC = 25°C
“
"
"
2
"
"
"
"
"
"
"
"
"
"
3
"
"
"
"
"
"
"
"
“
"
"
4
"
"
"
"
"
"
"
"
“
"
"
5
"
0.8 V
0.8 V
0.8 V
0.8 V
"
"
"
”
3007
6
"
"
"
"
"
"
"
"
“
VOL
“
"
7
"
"
"
"
"
"
"
"
’‘
“
"
8
"
"
"
"
"
"
"
"
"
"
9
"
"
"
"
"
"
"
"
“
"
"
10
"
2.0 V
2.0 V
2.0 V
2.0 V
"
"
"
“
“
VIC
11
-12 mA
“
12
“
“
13
“
“
14
“
"
15
“
“
"
"
17
“
"
18
"
“
"
19
"
“
IIL1
3009
20
0.4 V
“
IIL2
“
21
GND
0.4 V
“
“
“
22
B 2/
5.5 V
“
“
“
23
“
“
“
24
“
“
“
25
“
"
"
“
26
“
"
27
“
IIL3
“
28
-12 mA
-12 mA
-12 mA
-12 mA
16
-12 mA
-12 mA
0.4 V
QB
QA
VCC
-0.8 mA 4.5 V
-0.8 mA
-0.8 mA
-0.8 mA
-0.8 mA
16 mA
16 mA
16 mA
16 mA
terminal
Min
Unit
QA
2.4
QB
"
“
"
QC
"
“
V
“
"
QD
"
"
QD
"
"
QA
0.4
"
QB
“
“
"
QC
“
“
“
“
"
QD
"
“
"
QD
"
“
"
"
CLR
-1.5
“
16 mA
"
"
J
"
“
"
"
"
“
"
"
K
A
"
“
"
"
B
"
"
"
"
C
"
"
"
"
D
"
"
"
SL
"
“
"
CLK
"
"
-1.3
mA
-12 mA
-12 mA
5.5 V
5.5 V
CLR
5.5 V
"
J
5.5 V
"
5.5 V
"
0.4 V
"
GND
"
K
A
"
"
"
B
"
"
"
C
0.4 V
Max
"
"
0.4 V
See footnotes at end of device type 06.
QC
"
0.4 V
5.5 V
QD
A
"
"
"
D
"
0.4 V
"
SL
"
CLK
"
0.4 V
-0.4
7/
-0.7
-1.6
mA
MIL-M-38510/9E
73
“
QD
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
Cases E, F
1
2
3
4
5
6
7
8
9
10
method
Test No.
CLR
J
K
A
B
C
D
GND
13
14
15
16
Test limits
Max
Unit
CLR
40
µA
J
"
"
"
"
K
A
"
"
"
"
"
B
"
"
"
C
"
"
"
A
"
GND
"
"
5.5 V
"
"
5.5 V
“
“
“
31
GND
“
“
“
32
“
“
“
33
“
“
“
34
“
"
"
“
35
"
36
"
"
"
37
GND
"
"
IIH2
"
38
5.5 V
"
"
“
"
“
39
5.5 V
“
“
40
GND
“
“
“
41
“
“
“
42
“
“
“
43
“
“
44
“
"
"
"
45
"
"
"
46
GND
"
IOS
3011
47
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
"
GND
A
"
"
"
48
"
"
"
"
"
"
"
"
“
"
"
49
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
2.4 V
2.4 V
5.5 V
5.5 V
5.5 V
74
5.5 V
5.5 V
5.5 V
"
"
50
"
"
"
51
GND
ICC
3005
52
5.5 V
QB
QA
"
"
D
"
"
2.4 V
"
SL
"
"
"
2.4 V
GND
A
GND
GND
GND
GND
C LK
"
CLR
100
"
"
J
"
"
GND
"
"
5.5 V
"
K
A
"
"
"
"
"
"
"
B
"
"
"
"
"
C
"
"
"
"
"
D
"
"
"
"
"
SL
"
"
"
C LK
"
"
mA
5.5 V
"
GND
"
"
"
"
GND
Min
"
"
2
Same tests, terminal conditions, and limits as subgroup 1 except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions, and limits as subgroup 1 except TC = -55°C and VIC tests are omitted.
See footnotes at end of device type 06.
QC
"
"
5.5 V
“
QD
GND
2.4 V
“
QD
GND
GND
GND
GND
GND
GND
A
"
QA
-20
-57
"
QB
"
"
“
"
QC
"
"
“
"
QD
"
"
“
"
QD
"
"
“
"
VCC
63
“
MIL-M-38510/9E
2.4 V
30
2.4 V
"
GND
29
“
2.4 V
5.5 V
"
3010
"
5.5 V
terminal
CLK
IIH1
2.4 V
VCC
SL
1
”
12
Meas.
TC = 25°C
“
11
STD-883
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
STD-883
method
Test No.
CLR
J
K
A
B
C
D
GND
SL
CLK
QD
QD
QC
QB
QA
VCC
7
Truth
3014
53
B
B
B
B
B
B
B
GND
A
A
H
L
L
L
L
5.0 V
TC = 25°C
table
“
54
A
A
A
"
"
"
"
"
"
A
"
"
"
"
L
"
3/ 6/
test
“
55
"
"
"
"
"
"
"
"
"
B
"
"
"
"
L
"
“
5/
“
56
"
"
"
"
"
"
"
"
"
A
"
"
"
"
H
"
“
“
“
57
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
“
“
58
"
"
"
"
"
"
"
"
"
A
"
"
"
H
"
"
“
"
"
“
59
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
60
"
"
"
"
"
"
"
"
"
A
"
"
H
"
"
"
“
75
"
"
61
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
62
"
"
"
"
"
"
"
"
"
A
L
H
"
"
"
"
"
"
“
63
"
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
“
“
“
64
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
“
“
65
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
“
“
“
“
66
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
“
67
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
“
68
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
"
69
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
70
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
71
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
72
"
"
B
"
"
"
"
"
"
A
"
"
"
"
"
"
“
"
"
73
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
"
74
"
"
"
"
"
"
"
"
"
A
"
"
"
"
L
"
“
"
"
"
75
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
76
"
"
"
"
"
"
"
"
"
A
"
"
"
L
"
"
"
"
"
77
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
"
"
"
78
"
"
"
"
"
"
"
"
"
A
"
"
L
"
"
"
“
"
"
79
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
"
“
"
"
80
"
"
"
"
"
"
"
"
"
A
H
L
"
"
"
"
“
"
"
81
"
"
"
A
"
A
"
"
B
A
"
"
"
"
"
"
“
"
"
82
"
"
"
A
"
A
"
"
"
B
"
"
"
"
"
"
“
"
"
83
"
"
"
A
"
A
"
"
"
A
"
"
H
"
H
"
”
"
"
84
"
"
"
B
A
B
A
"
"
A
"
"
H
"
H
"
See footnotes at end of device type 06.
terminal
Min
Max
Unit
4/
MIL-M-38510/9E
"
“
Test limits
Meas.
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
STD-883
method
Test No.
CLR
J
K
A
B
C
D
GND
SL
CLK
QD
QD
QC
QB
QA
VCC
7
Truth
3014
85
A
B
B
B
A
B
A
GND
B
B
H
L
H
L
H
5.0 V
TC = 25°C
3/ 6/
table
“
86
"
"
"
B
"
B
"
"
"
A
L
H
L
H
L
"
test
“
87
"
"
"
A
"
A
"
"
"
A
"
"
L
"
L
"
“
5/
“
88
"
"
"
"
"
"
"
"
"
B
"
"
L
"
L
"
“
“
“
89
"
"
"
"
"
"
"
"
"
A
"
"
H
"
H
"
“
“
“
90
B
"
"
"
"
"
"
"
"
B
H
L
L
L
L
"
“
"
"
“
91
B
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
92
B
A
A
"
"
"
"
"
"
"
"
"
"
"
"
"
“
"
"
93
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
94
B
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
“
95
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
“
“
96
A
"
"
B
B
B
B
"
"
B
"
"
"
"
"
"
“
“
97
A
"
"
B
B
B
B
"
"
A
"
"
"
"
H
"
“
terminal
Min
Max
Unit
4/
Repeat subgroup 7 at except TC = 125°C and TC = -55°C.
76
fMAX
(Fig 9)
98
B
GND
5.0 V
IN
OUT
5.0 V
QA
15
TC = 25°C
tPHL1
3003
99
IN
5.0 V
5.0 V
5.0 V
5.0 V
GND
GND
"
OUT
"
CLR to QA
7
30
“
"
"
(Fig 9)
100
"
"
"
"
"
"
"
"
"
CLR to QB
"
"
"
"
101
"
"
"
"
"
"
"
"
"
CLR to QC
"
"
"
"
"
"
102
"
"
"
"
"
"
"
"
"
CLR to QD
"
"
"
"
"
103
B
IN
"
IN
"
"
CLK to QA
"
24
"
"
tPHL2
"
"
104
"
"
"
"
"
CLK to QB
"
"
"
“
"
"
105
"
“
"
"
106
"
"
tPHL2
"
107
"
"
"
"
108
"
“
"
"
109
"
“
"
"
110
"
“
See footnotes at end of device type 06.
5.0 V
GND
IN
IN
IN
IN
IN
IN
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
MHz
ns
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
"
CLK to QA
"
29
"
"
CLK to QB
"
"
"
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
MIL-M-38510/9E
"
8
9
Test limits
Meas.
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V or L < 0.8 V or open).
MILSubgroup
Symbol
Cases E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
STD-883
Test limits
Meas.
method
Test No.
CLR
J
K
5.0 V
GND
A
B
C
D
GND
SL
CLK
QD
QD
QC
QB
QA
VCC
terminal
Min
Max
Unit
10
fMAX
(Fig 9)
111
B
GND
5.0 V
IN
OUT
5.0 V
QA
12
TC = 125°C
“
3003
112
IN
5.0 V
5.0 V
5.0 V
5.0 V
GND
GND
"
OUT
"
CLR to QA
7
34
(Fig 9)
113
"
"
"
"
"
"
"
"
"
CLR to QB
"
"
"
“
tPHL1
"
"
"
114
"
"
"
"
"
"
"
"
"
CLR to QC
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
"
"
"
"
"
115
"
"
tPHL2
"
116
B
IN
"
"
"
117
"
“
"
"
118
"
“
"
"
119
"
"
tPHL2
"
120
"
"
“
"
"
121
"
"
"
122
"
"
"
123
"
“
2
IN
IN
IN
IN
IN
IN
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
CLR to QD
"
"
"
CLK to QA
"
28
"
"
CLK to QB
"
"
"
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
CLK to QA
"
34
"
"
"
CLK to QB
"
"
"
"
CLK to QC
"
"
"
"
CLK to QD
"
"
"
Same tests, terminal conditions, and limits as subgroup 10 except TC = -55°C.
77
A = normal clock pulse, except for subgroup 7 and 8 (see 3/).
B = momentary GND, then VIN except for subgroups 7 and 8. For subgroups 1, 2 and 3, VIN = VCC; for subgroups 9, 10 and 11, VIN = 3.0 V minimum (see figure 11).
For subgroups 7 and 8, A = VCC and B = GND.
Output voltages shall be either:
(a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or
(b) H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
5/ The tests in subgroups 7 and 8 shall be performed in the sequence specified.
6/ Only a summary of attributes data is required.
7/ For device type 06, schematic circuits A and B, the minimum and maximum limits shall be -0.4 and -1.3 mA, respectively. For schematic C, the minimum and maximum
limits shall be -0.7 and -1.6 mA, respectively.
1/
2/
3/
4/
ns
MIL-M-38510/9E
"
"
OUT
MHz
MIL-M-38510/9E
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel,
these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging
requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense
Agency, or within the military service's system command. Packaging data retrieval is available from the managing
Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the
responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but it not mandatory)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a. Title, number, and date of the specification.
b. PIN and compliance identifier, if applicable (see 1.2).
c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d. Requirement for certificate of compliance, if applicable.
e. Requirements for notification of change of product or process to acquiring activity in addition to
notification to the qualifying activity, if applicable.
f. Requirements for failure analysis (including required test condition of method 5003), corrective action and
reporting of results, if applicable.
g. Requirements for product assurance options.
h. Requirements for carriers, special lead lengths or lead forming, if applicable. These requirements shall
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
i. Requirements for "JAN" marking.
j. Packaging requirements (see 5.1).
6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
78
MIL-M-38510/9E
6.5 Abbreviations, symbols and definitions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535 and MIL-HDBK-1331, and as follows:
GND .................................................. Electrical ground (common terminal)
VIN ..................................................... Voltage level at an input terminal
IIN ...................................................... Current-flowing into an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer lead lengths and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Device type
01
02
03
04
05
06
Commercial type
5495
5496
54164
54165
54194
54195
6.8 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect
to the previous issue due to the extensiveness of the changes.
Custodians:
Army - CR
Navy - EC
Air Force - 11
DLA - CC
Preparing activity:
DLA - CC
(Project 5962-2091)
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
NOTE: The activities listed above were interested in this document as of the date of this document. Since
organizations and responsibilities can change, you should verify the currency of the information above using the
ASSIST Online database at http://assist.daps.dla.mil.
79
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