Download datasheet for 54H22/BCA by Rochester Electronics

Download datasheet for 54H22/BCA by Rochester Electronics
INCH-POUND
MIL-M-38510/23D
11 July 2003
SUPERSEDING
MIL-M-38510/23A
14 July 1972
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, TTL, HIGH SPEED, NAND GATES MONOLITHIC SILICON
This specification is approved for use by all Departments and Agencies of the Department of Defense.
Inactive for new design after 06 September 1996
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, high speed, positive
NAND logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are
provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have
been superseded by MIL-PRF-38535, (see 6.3)
1.2 Part number. The part number should be in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types should be as follows:
Circuit
Single, 8-input, positive NAND gate
Dual, 4-input, positive NAND gate
Triple, 3-input, positive NAND gate
Quadruple, 2-input, positive NAND gate
Hex, 1-input, inverter gate
Quadruple, 2-input positive NAND gate (open collector output)
Dual, 4-input positive NAND gate (open collector output)
Device type
01
02
03
04
05
06
07
1.2.2 Device class. The device class should be the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outline. The case outline should be as designated in MIL-STD-1835 and as follows:
Outline letter
A 1/
B 1/
C
D
Descriptive designator
GDFP5-F14 or CDFP6-F14
GDFP4-14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
Terminals
14
14
14
14
Package style
Flat pack
Flat pack
Dual-in-line
Flat pack
______
1/ Inactive package case outline.
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in
improving this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN:
DSCC-VAS, P.O. Box 3990, Columbus, OH 43216-5000, using the self addresses Standardization Document
Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
AMSC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5962
MIL-M-38510/23D
1.3 Absolute maximum ratings.
Supply voltage range ........................................................................
Input voltage range ...........................................................................
Storage temperature range ...............................................................
Maximum power dissipation per gate (PD) .......................................
Lead temperature (soldering, 10 seconds) ......................................
Junction temperature (TJ) .................................................................
Thermal resistance, junction-to-case ( JC):
Cases A, B, C, and D ....................................................................
-0.5 V dc to +7.0 V dc
-1.5 V dc at -12 mA to +5.5 V dc
-65°C to +150°C
60 mW dc 2/
+300°C.
+175°C
See MIL-STD-1835
1.4 Recommended operating conditions.
Supply voltage (VCC) ........................................................................ 4.5 V dc minimum to 5.5 V dc maximum
Minimum high-level input voltage (VIH) ............................................. 2.0 V dc
Maximum low-level input voltage (VIL) .............................................. 0.8 V dc
Normalized fanout (each output) ....................................................... 10 maximum 3/
Ambient operating temperature range (TC) ...................................... -55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this
specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those
listed in the issue of the Departments of Defense Index of Specifications and Standards (DODISS) and supplement
thereto, cited in the solicitation.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535
- Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
- Test Method Standard for Microelectronics.
- Interface Standard Electronic Component Case Outlines.
(Copies of these documents are available from the Standardization Document Order Desk, 700 Robbins Avenue,
Building 4D, Philadelphia, PA 19111-5094.
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein the text of this document shall takes precedence. Nothing in this document, however, supersedes applicable
laws and regulations unless a specific exemption has been obtained.
______
2/ Must withstand the added PD due to short circuit test (e.g., IOS) at one output for 5 seconds duration.
3/ The device shall fanout in both high and low levels to the specified number of inputs of the same device
type as that being tested.
2
MIL-M-38510/23D
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein. This slash sheet has been modified to allow the
manufacturer to use alternate die/fabrication requirements of paragraph A.3.2.2 of MIL-PRF-38535 or other
alternative approved by the Qualifying Activity.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Logic diagrams and terminal connections. The logic diagram and terminal connections shall be as specified
on figure 1.
3.3.2 Truth tables and logic equations. The truth tables and logic equations shall be as specified on figure 2.
3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying activity and the preparing activity (DSCC-VA) upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I,
and apply over the full recommended ambient operating temperature range, unless otherwise specified.
3.6 Rebonding. Rebonding shall be in accordance with MIL-PRF-38535.
3.7 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.8 Marking. Marking shall be in accordance with MIL-PRF-38535. For class Q product built in accordance with
A.3.2.2 of MIL-PRF-38535, or as modified in the manufacturer's Quality Management (QM) Plan, the "QD"
certification mark shall be used in place of the "QML" or "Q" certification mark.
3.9 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 1 (see MIL-PRF-38535, appendix A).
3
MIL-M-38510/23D
TABLE I. Electrical performance characteristics.
Limits
Test
Symbol
Conditions
-55°C ≤ TA ≤ +125°C
High-level output
VOH
voltage
Low-level output
VCC = 4.5 V, VIN = 0.8 V,
1/
voltage
Min
01,02,03,
2.4
Max
Units
V
04,05
IOH = -500 µA
VOL
Device
type
VCC = 4.5 V, IOL = 20 mA,
1/
01-07
0.4
V
01-07
-1.5
V
06,07
250
µA
VIN = 2.0 V for all inputs of gate
under test
Input clamp voltage
VIC
VCC = 4.5 V, IIN = -12 mA,
Maximum collector
ICEX
VOH = 5.5 V,
TA = +25°C
cut-off-current
VCC = 4.5 V, VIN = 0.8 V
High-level input
IIH1
VCC = 5.5 V, VIN = 2.4 V
2/
01-07
50
µA
current
High-level input
IIH2
VCC = 5.5 V, VIN = 5.5 V
2/
01-07
100
µA
current
Low-level input
IIL
VCC = 5.5 V, VIN = 0.4 V
1/
01-07
-1.0
-2.0
mA
current
Short-circuit output
IOS
VCC = 5.5 V
-40
-100
mA
current
High-level supply
ICCH
VCC = 5.5 V, VIN = 0 V
2/
04,05
01-07
4.2
mA
current per gate
Low-level supply
ICCL
VCC = 5.5 V,
1/
01-07
10
mA
current per gate
2/ 3/
01,02,03,
VIN = 5.5 V
Propagation delay time tPHL
high-to-low level
CL = 50 pF,
01,
2
18
RL = 280 Ω
2
16
Propagation delay time tPLH
low-to-high level
CL = 50 pF,
02,03,
04,05
06,07
01
3
2
18
16
2
15
3
21
02,03,
04,05
06,07
RL = 280 Ω
1/ All unspecified inputs at 5.5 volts.
2/ All unspecified inputs grounded.
3/ Not more than one output should be shorted at a time
4
ns
ns
MIL-M-38510/23D
TABLE II. Electrical test requirements.
Subgroups (see table III)
Class S
Class B
devices
devices
MIL-PRF-38535
test requirements
Interim electrical parameters
1
Final electrical test parameters
Group A test requirements
Group B electrical test parameters when
using the method 5005 QCI option
Group C end-point electrical
parameters
Group D end-point electrical
parameters
1
1*, 2, 3,
9
1, 2, 3,
9, 10, 11
1, 2, 3
1*, 2, 3,
9
1, 2, 3,
9, 10, 11
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
N/A
*PDA applies to subgroup 1 (see 4.3c).
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or
as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not
effect the form, fit, or function as function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior
to qualification and quality conformance inspection. The following additional criteria shall apply:
a.
The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c.
Additional screening for space level product shall be as specified in MIL-PRF-38535.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
5
MIL-M-38510/23D
Figure 1. Logic diagrams and terminal connections (top views).
6
MIL-M-38510/23D
Figure 1. Logic diagrams and terminal connections (top views).
7
MIL-M-38510/23D
Device type 01
Truth table
Input
Output
A
B
C
D
E
F
G
H
Y
H
H
H
H
H
H
H
H
L
All other combinations of H and L at the inputs give H output.
Positive logic Y = ABCDEFGH
Device types 02 and 07
A
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
B
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
Truth table
Input
C
D
L
L
L
L
L
L
L
L
H
L
H
L
H
L
H
L
L
H
L
H
L
H
L
H
H
H
H
H
H
H
H
H
Positive logic Y = ABCD
FIGURE 2. Truth tables.
8
Output
Y
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
L
MIL-M-38510/23D
Device type 03
Truth table
Input
B
C
L
L
L
L
H
L
H
L
L
H
L
H
H
H
H
H
A
L
H
L
H
L
H
L
H
Output
Y
H
H
H
H
H
H
H
L
Positive logic Y = ABC
Device types 04 and 06
A
L
H
L
H
Truth table each gate
INPUT
OUTPUT
B
Y
L
H
L
H
H
H
H
L
Positive logic Y = AB
Device type 05
Truth table each gate
Input
Output
A
Y
L
H
H
L
Positive logic Y = A
FIGURE 2. Truth tables – Continued.
9
MIL-M-38510/23D
Notes:
1. CL = 50 pF minimum, including scope probe, wiring, and stray capacitance, without package in
test fixture.
2. Voltage measurements are to be made with respect to network ground terminal.
3. All diodes are 1N3064 or equivalent
4. RL = 280 Ω ±5%.
FIGURE 3. Switching time test circuit except for open collector circuits.
10
MIL-M-38510/23D
Notes:
1. CL = 50 pF minimum, including scope probe, wiring, and stray capacitance, without package in
test fixture.
3. Voltage measurements are to be made with respect to network ground terminal.
3. All diodes are 1N3064 or equivalent
4. RL = 280 Ω ±5%.
FIGURE 4. Switching time test circuit for open collector circuits.
11
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
Symbol
VOL
VOH
TA =
+25°C
IOS
II H 1
II H 2
ICCL
ICCH
VI C
3007
3006
“
“
“
“
“
“
“
3011
3010
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
3005
3005
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
1
2
3
4
5
6
7
8
9
10
11
12
13
14
13
1
2
14
3
4
5
6
11
12
7
8
9
10
NC
A
B
VCC
C
D
E
F
G
H
GND
Y
NC
NC
2.0 V
0.8 V
5.5 V
“
“
“
“
“
“
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
“
0.4 V
5.5 V
“
“
“
“
“
“
5.5 V
GND
-12 mA
2.0 V
5.5 V
0.8 V
5.5 V
“
“
“
“
“
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
5.5 V
GND
4.5 V
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
5.5 V
4.5 V
“
“
“
“
“
“
“
2.0 V
5.5 V
5.5 V
0.8 V
5.5 V
“
“
“
“
GND
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 v
GND
“
“
“
“
5.5 v
5.5 V
0.4 V
5.5 V
“
“
“
“
5.5 V
GND
2.0 V
5.5 V
“
“
0.8 V
5.5 V
“
“
“
GND
GND
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
5.5 V
“
“
0.4 V
5.5 V
“
“
“
5.5 V
GND
2.0 V
5.5 V
“
“
“
0.8 V
5.5 V
“
“
GND
GND
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
5.5 V
“
“
“
0.4 V
5.5 V
“
“
5.5 V
GND
2.0 V
5.5 V
“
“
“
“
0.8 V
5.5 V
“
GND
GND
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
5.5 V
“
“
“
“
0.4 V
5.5 V
“
5.5 V
GND
2.0 V
5.5 V
“
“
“
“
“
0.8 V
5.5 V
GND
GND
“
“
“
“
“
2.4 V
GND
GND
“
“
“
“
“
5.5 V
GND
5.5 V
“
“
“
“
“
0.4 V
5.5 V
5.5 V
GND
2.0 V
5.5 V
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
20 mA
-0.5 mA
“
“
“
“
“
“
“
GND
-12 mA
“
“
0.8 V
GND
GND
“
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
5.5 V
“
“
“
“
“
“
0.4 V
5.5 V
GND
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
Test limits
Measured
terminal
Y
Y
“
“
“
“
“
“
“
Y
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
VCC
VCC
A
B
C
D
E
F
G
H
Min
2.4
“
“
“
“
“
“
“
-40
-1.0
“
“
“
“
“
“
“
Max
Unit
0.4
V
“
“
“
“
“
“
“
“
mA
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
mA
mA
V
“
“
“
“
“
“
“
-100
50
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
-2.0
“
“
“
“
“
“
“
10
4.2
-1.5
“
“
“
“
“
“
“
MIL-M-38510/23D
12
II L
MIL-STD883
method
Cases
A,B,D
Case
C
Test no.
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
MIL-STDSymbol
883
method
Cases
A,B,D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Case
C
13
1
2
14
3
4
5
6
11
12
7
8
9
10
Test no.
NC
A
B
VCC
C
D
E
F
2
Same tests, terminal conditions and limits as for subgroup 1, except TA = 125° C, and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TA = -55° C, and VI C tests are omitted.
tPHL
tPLH
tPHL
tPLH
tPHL
tPLH
3003
(Fig. 3)
3003
(Fig. 3)
3003
(Fig. 3)
45
46
47
48
49
50
IN
IN
IN
IN
IN
IN
2.4 V
“
2.4 V
“
2.4 V
“
5.0 V
“
5.0 V
“
5.0 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
H
GND
Y
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
GND
“
GND
“
GND
“
OUT
“
OUT
“
OUT
“
NC
Measured
terminal
Min
Max
Unit
A to Y
A to Y
A to Y
A to Y
A to Y
A to Y
2
2
2
2
2
2
14
12
16
16
18
14
NC
ns
“
“
“
“
“
13
MIL-M-38510/23B
9
TA = +25°C
10
TA = +125°C
11
TA = -55°C
G
Limits
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
TA = +25°C
Symbol MIL-STD883
method
VO L
Cases
A,B,D
Case
C
Test no.
ICCH
3005
38
VOH
IOS
II H 1
II H 2
14
IIL
3
4
5
6
7
8
9
10
11
12
13
14
1
6
3
14
11
9
10
12
13
8
7
2
4
5
1A
1Y
NC
VCC
NC
2A
2B
2C
2D
2Y
GND
1B
1C
1D
2.0 V
5.5 V
0.8 V
5.5 V
“
“
“
“
“
“
GND
20 mA
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
2.0 V
5.5 V
5.5 V
0.8 V
5.5 V
“
“
“
“
“
GND
2.0 V
5.5 V
“
“
0.8 V
5.5 V
“
“
“
“
GND
2.0 V
5.5 V
“
“
“
0.8 V
5.5 V
“
“
“
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
5.5 V
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
5.5 V
5.5 V
0.4 V
5.5 V
“
“
“
“
5.5 V
GND
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
5.5 V
5.5 V
5.5 V
0.4 V
5.5 V
“
“
“
5.5 V
1Y
2Y
1Y
1Y
1Y
1Y
2Y
2Y
2Y
2Y
1Y
2Y
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
VCC
“
GND
GND
GND
VCC
5.5 V
2.0 V
5.5 V
“
“
“
0.8 V
5.5 V
“
“
5.5 V
2.0 V
5.5 V
“
“
“
“
0.8 V
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
0.8 V
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
“
0.8 V
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
”
“
“
“
0.4 V
5.5 V
“
“
“
“
”
“
5.5V
4.5 V
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
5.5V
GND
GND
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
5.5 V
“
“
“
0.4 V
5.5 V
“
“
5.5 V
GND
GND
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
5.5 V
“
“
“
“
0.4 V
5.5 V
“
5.5 V
GND
GND
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
5.5 V
“
“
“
“
“
0.4 V
5.5 V
5.5 V
GND
GND
“
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
5.5 V
“
“
“
“
“
“
0.4 V
5.5 V
GND
5.5 V
GND
GND
GND
GND
-.5 mA
-.5 mA
-.5 mA
-.5 mA
GND
20 mA
-.5 mA
-.5 mA
-.5 mA
-.5 mA
GND
Limits
Measured
terminal
Min
2.4
“
“
“
“
“
“
“
-40
-40
-1.0
“
“
“
“
“
“
"
Max
Unit
0.4
0.4
-100
-100
50
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
-2.0
“
“
“
“
“
“
“
20
V
“
“
“
“
“
“
“
“
“
mA
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
mA
8.4
mA
MIL-M-38510/23D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
2
M
ICCL
3007
“
3006
“
“
“
“
“
“
“
3011
“
3010
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
3005
1
TABLE III. Group A inspection for device type 02 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
Symbol MIL-STD883
method
VI C
TA = +25°C
Cases
A,B,D
Case
C
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
6
3
14
11
9
10
12
13
8
7
2
4
5
1A
39
-12 mA
1Y
NC
VCC
NC
2A
2B
2C
GND
“
“
41
“
“
42
“
“
43
“
44
“
45
“
46
“
-12 mA
-12 mA
-12 mA
-12 mA
Same tests, terminal conditions and limits as for subgroup 1, except TA =+125°C and VIC tests are omitted.
Same tests, terminal conditions and limits as for subgroup 1, except TA =-55°C and VIC tests are omitted.
tPHL
tPLH
10
tPHL
tPLH
15
11
tPHL
TA = -55°C
tPLH
3003
(Fig. 3)
47
48
IN
3003
(Fig. 3)
3003
(Fig. 3)
49
50
51
52
IN
3003
(Fig. 3)
3003
(Fig. 3)
53
54
55
56
IN
3003
(Fig. 3)
57
58
IN
IN
IN
OUT
OUT
OUT
OUT
OUT
OUT
5.0 V
“
“
“
5.0 V
“
IN
2.4 V
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
OUT
1B
1C
Measured
terminal
Unit
Min
Max
1D
-12 mA
-12 mA
1A
-1.5
V
1B
“
“
1C
“
“
1D
“
“
“
2A
“
“
“
2B
“
“
“
2C
“
“
“
2D
“
“
-12 mA
GND
“
2.4 V
2.4 V
2.4 V
“
1A to 1Y
2A to 2Y
2
“
12
“
ns
“
“
“
GND
“
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
“
2.4 V
“
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
2
“
2
“
12
“
14
“
“
“
“
“
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
“
2.4 V
“
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
2
“
2
“
15
“
16
“
“
“
“
“
2.4 V
2.4 V
2.4 V
“
1A to 1Y
2A to 2Y
2
“
13
“
“
“
“
“
5.0 V
“
IN
2.4 V
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
OUT
“
“
GND
“
“
“
IN
2.4 V
2.4 V
2.4 V
OUT
“
“
MIL-M-38510/23D
TA = +125°C
GND
4.5 V
3
TA = +25°C
2Y
40
2
9
2D
Limits
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
TA = +25°C
MIL-STDSymbol
883
method
VO L
“
“
VOH
5
6
7
8
9
10
11
12
13
14
1
2
12
14
6
3
4
5
9
10
7
11
8
13
1A
1B
1Y
VCC
2Y
2A
2B
2C
3A
3B
GND
3C
3Y
1C
20 mA
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
“
“
“
“
“
“
5.5 V
2.0 V
5.5 V
5.5 V
“
“
0.8 V
5.5 V
5.5 V
2.0 V
5.5 V
5.5 V
“
“
“
“
0.8 V
5.5 V
“
“
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
0.8 V
5.5 V
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
“
0.8 V
5.5 V
GND
“
“
“
5.5 V
2.0 V
5.5 V
5.5 V
“
“
“
0.8 V
5.5 V
“
“
“
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
“
“
0.8 V
GND
GND
GND
GND
“
“
2.4 V
GND
“
“
“
‘
GND
“
“
“
2.4 V
GND
“
“
“
“
“
“
“
5.5 V
GND
“
“
“
5.5 V
“
“
“
0.4 V
5.5 V
“
“
“
GND
GND
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
“
5.5 V
GND
“
“
5.5 V
“
“
“
“
0.4 V
5.5 V
“
“
GND
GND
GND
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
“
5.5 V
GND
GND
5.5 V
“
“
“
“
“
0.4 V
5.5 V
“
GND
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
“
5.5 V
0.8 V
5.5 V
3011
“
“
3010
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
GND
GND
2.4 V
GND
“
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
“
“
0.4 V
5.5 V
“
“
“
“
“
“
“
GND
GND
2.4 V
GND
“
“
“
“
“
“
GND
5.5 V
GND
“
“
“
“
“
5.5 V
“
“
5.5 V
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
“
GND
5.5 V
“
“
“
“
“
“
“
“
5.5 V
5.5 V
GND
“
“
“
“
5.5 V
“
“
0.4 V
5.5 V
“
“
“
“
GND
5.5 v
5.5 v
5.5 V
5.5 V
ICCL
3005
44
-.5 mA
-.5 mA
-.5 mA
GND
20 mA
-.5 mA
-.5 mA
-.5 mA
GND
“
“
“
“
“
“
“
“
“
GND
GND
“
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
“
5.5 V
GND
5.5 V
“
“
“
“
“
“
0.4 V
5.5 V
GND
GND
“
“
GND
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
GND
GND
“
“
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
“
5.5 V
5.5 V
“
“
“
“
“
“
“
0.4 V
GND
5.5 V
“
5.5 V
20 mA
-.5 mA
-.5 mA
-.5 mA
Limits
Measured
terminal
2.0V
5.5 V
“
“
“
0.8 V
5.5 V
“
“
“
“
“
1Y
2Y
3Y
1Y
1Y
1Y
2Y
2Y
2Y
3Y
3Y
3Y
GND
“
“
5.5 V
GND
“
“
“
“
“
5.5 V
5.5 V
0.4 V
5.5 V
“
“
“
“
“
GND
1Y
2Y
3Y
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
VCC
5.5 V
VCC
GND
GND
GND
2.4 V
GND
“
“
“
“
Min
Max
Unit
0.4
“
“
V
“
“
“
“
“
“
“
“
“
“
-100
“
“
50
“
“
“
“
“
“
“
mA
“
“
µA
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-2.0
“
“
“
“
“
“
“
“
12.6
mA
“
“
“
“
“
“
“
“
mA
30
“
2.4
“
“
“
“
“
“
“
“
-40
“
“
-1.0
“
“
“
“
“
“
“
“
MIL-M-38510/23D
16
-
4
2.0 V
5.5 V
“
0.8 V
5.5 V
“
“
“
“
“
“
3005
II L
3
1
2
3
4
5
6
7
8
9
10
11
12
ICCH
II H 2
2
3007
“
“
3006
“
“
“
“
“
“
“
“
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
IIH1
1
M
IOS
Cases
A,B,D
Case
C
Test no.
TABLE III. Group A inspection for device type 03 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
MIL-STDSymbol
883
method
VIC
Cases
A,B,D
Case
C
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
2
12
14
6
3
4
5
9
10
7
11
8
13
1A
1B
1Y
VCC
2Y
2A
2B
2C
3A
3B
GND
3C
3Y
1C
45
-12 mA
46
TA = +25°C
-12 mA
1A
-1.5
V
1B
“
“
“
“
49
“
50
“
51
“
52
“
53
“
“
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
tPLH
10
tPHL
TA = +125°C
17
tPLH
11
tPHL
TA = -55°C
tPLH
“
3003
(Fig. 3)
“
3003
(Fig. 3)
56
57
58
59
60
61
“
3003
(Fig. 3)
“
3003
(Fig. 3)
62
63
64
65
66
67
“
3003
(Fig. 3)
“
68
69
70
71
IN
IN
IN
IN
IN
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
OUT
OUT
OUT
OUT
OUT
OUT
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
OUT
IN
2.4 V
“
“
2A
“
“
“
2B
“
“
“
2C
“
“
“
3A
“
“
“
3B
“
“
3C
“
“
IN
2.4 V
IN
2.4 V
IN
2.4 V
IN
2.4 V
IN
2.4 V
2.4 V
2.4 V
IN
OUT
2.4 V
2.4 V
IN
OUT
2.4 V
2.4 V
IN
OUT
2.4 V
2.4 V
IN
OUT
-12 mA
GND
“
2.4 V
IN
OUT
-12 mA
2.4 V
2.4 V
IN
2.4 V
2.4 V
“
“
“
“
“
“
2.4 V
“
“
“
“
“
“
2.4 V
“
“
“
“
2.4 V
OUT
2.4 V
2.4 V
OUT
2.4 V
OUT
2.4 V
2.4 V
OUT
2.4 V
OUT
2.4 V
2.4 V
OUT
1A to 1Y
2A to 2Y
2
“
12
“
ns
“
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
“
2
“
“
2
“
“
12
“
“
14
“
“
“
“
“
“
“
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
“
2
“
“
2
“
“
15
“
“
16
“
“
“
“
“
“
“
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
“
2
“
“
“
13
“
“
“
“
“
“
MIL-M-38510/23D
Same tests, terminal conditions and limits as for subgroup 1, except TA = -55°C and VIC tests are omitted.
2.4 V
1C
“
“
Same tests, terminal conditions and limits as for subgroup 1, except TA = +125°C and VIC tests are omitted.
IN
Unit
“
48
54
55
Max
GND
47
3003
(Fig. 3)
Min
“
3
tPHL
Measured
terminal
4.5 V
2
9
TA = +25°C
Limits
TABLE III. Group A inspection for device type 04 .
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
TA = +25°C
MIL-STDSymbol
883
method
VO L
“
“
“
VOH
18
II H 2
II L
ICCH
ICCL
3010
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
3005
3005
2
3
4
5
6
7
8
9
10
11
12
13
14
1
2
3
14
6
4
5
8
9
10
7
12
13
11
1A
1B
1Y
VCC
2Y
2A
2B
3Y
3A
3B
GND
4A
4B
4Y
2.0 V
5.5 V
“
“
0.8 V
5.5 V
“
“
“
“
“
“
GND
2.0 V
5.5 V
“
“
5.5 V
0.8 V
5.5 V
20 mA
4.5 V
“
“
“
4.5 V
“
“
“
“
“
“
“
5.5 V
“
“
“
5.5 V
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
5.5 V
5.5 V
“
0.8 V
5.5 V
“
“
“
“
5.5 V
2.0 V
5.5 V
5.5 V
5.5 V
“
“
0.8 V
5.5 V
“
“
“
5.5 V
5.5 V
2.0 V
5.5 v
5.5 V
“
“
“
0.8 V
5.5 V
“
“
5.5 V
5.5 V
2.0 V
5.5 v
5.5 V
“
“
“
5.5 V
0.8 V
5.5 V
“
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
0.8 V
5.5 V
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
“
“
“
“
“
5.5 V
0.8 V
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
“
0.4 V
5.5 V
“
“
“
“
“
“
GND
5.5 V
GND
GND
2.4 V
GND
“
“
“
“
“
GND
5.5 V
GND
“
“
“
“
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
GND
5.5 V
-.5 mA
-.5 mA
GND
20 mA
-.5 mA
-.5 mA
GND
20 mA
“
“
“
-.5 mA
-.5 mA
GND
GND
GND
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
5.5 V
“
0.4 V
5.5 V
“
“
“
“
GND
5.5 V
GND
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
5.5 V
“
“
0.4 V
5.5 V
“
“
“
GND
5.5 V
GND
GND
GND
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
GND
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
5.5 V
“
“
“
0.4 V
5.5 V
“
“
GND
5.5 V
GND
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
5.5 V
“
“
“
5.5 V
0.4 V
5.5 V
5.5 V
GND
5.5 V
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
GND
GND
GND
“
“
“
“
“
2.4 V
GND
GND
“
“
“
“
“
5.5 V
GND
5.5 V
“
“
“
“
“
0.4 V
5.5 V
GND
5.5 V
GND
GND
“
“
“
“
“
“
2.4 v
GND
“
“
“
“
“
“
5.5 V
5.5 V
“
“
“
“
“
“
0.4 V
GND
5.5 V
20 mA
-.5 mA
-.5 mA
GND
Limits
Measured
terminal
1Y
2Y
3Y
4Y
1Y
1Y
1Y
2Y
2Y
2Y
3Y
3Y
1Y
2Y
3Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
VCC
VCC
Min
2.4
“
“
“
“
“
“
“
-40
“
“
“
-1.0
“
“
“
“
“
“
“
Max
Unit
0.4
“
“
“
V
“
“
-100
“
“
“
50
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
-2.0
“
“
“
“
“
“
“
16.8
40
“
“
“
“
“
“
“
“
mA
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
mA
mA
MIL-M-38510/23D
IIH1
3006
“
“
“
“
“
“
“
3011
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
1
IL-M-
IOS
3007
“
“
Cases
A,B,D
Case
C
Test no.
TABLE III. Group A inspection for device type 04 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
MIL-STDSymbol
883
method
VIC
Cases
A,B,D
Case
C
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
2
3
14
6
4
5
8
9
10
7
12
13
11
1A
1B
1Y
VCC
2Y
2A
2B
3Y
3A
3B
GND
4A
4B
4Y
43
-12 mA
44
45
46
47
TA = +25°C
-12 mA
1A
-1.5
V
1B
2A
2B
3A
“
“
“
“
“
“
“
“
-12 mA
-12 mA
-12 mA
49
“
“
50
“
“
-12 mA
Same tests, terminal conditions and limits as for subgroup 1, except TA = +125°C and VIC tests are omitted.
Same tests, terminal conditions and limits as for subgroup 1, except TA = -55°C and VIC tests are omitted.
TA = +25°C
tPLH
tPHL
19
TA = +125°C
tPLH
11
tPHL
TA = -55°C
tPLH
51
52
“
“
“
3003
(Fig. 3)
“
“
3003
53
54
55
56
57
58
59
OUT
OUT
“
“
“
“
“
“
5.0 V
OUT
OUT
IN
2.4 V
2.4 V
OUT
5.0 V
(Fig. 3)
60
“
“
“
3003
61
62
63
“
“
“
(Fig. 3)
64
“
“
65
“
IN
2.4 V
“
66
3003
67
(Fig. 3)
68
“
“
69
“
“
70
“
3003
71
OUT
IN
IN
IN
2.4 V
2.4 V
OUT
OUT
IN
IN
IN
“
2.4 V
“
“
“
“
2.4 V
“
“
“
2
“
“
12
“
“
“
“
“
GND
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2
14
ns
“
2A to 2Y
“
“
“
“
“
“
“
“
3A to 3Y
4A to 4Y
1A to 1Y
2
15
“
“
2A to 2Y
“
“
“
“
3A to 3Y
“
“
“
2.4 V
2.4 V
OUT
IN
2.4 V
IN
OUT
IN
2.4 V
OUT
IN
2.4 V
“
(Fig. 3)
72
“
73
“
“
74
“
IN
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
OUT
OUT
OUT
OUT
4A to 4Y
GND
1A to 1Y
2
16
ns
“
2A to 2Y
“
“
“
3A to 3Y
“
“
“
2
13
“
“
IN
OUT
ns
“
IN
OUT
“
12
2.4 V
OUT
“
“
IN
IN
4B
2
2.4 V
OUT
“
“
2A to 2Y
IN
IN
“
“
1A to 1Y
5.0 V
“
-12 mA
3B
4A
“
“
IN
-12 mA
GND
2.4 V
OUT
“
2.4 V
OUT
4A to 4Y
“
1A to 1Y
“
2A to 2Y
“
“
“
“
3A to 3Y
“
“
“
IN
2.4 V
OUT
4A to 4Y
MIL-M-38510/23D
10
3003
(Fig. 3)
IN
OUT
Unit
“
“
“
“
“
2.4 V
Max
GND
48
IN
Min
“
“
“
“
3
tPHL
Measured
terminal
4.5 V
2
9
Limits
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
TA = +25°C
MIL-STDSymbol
883
method
VO L
Cases
A,B,D
Case
C
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
4
3
14
5
6
9
8
11
10
7
12
13
2
1A
2Y
2A
VCC
3A
3Y
4A
4Y
5A
5Y
GND
6Y
6A
1Y
20 mA
20 mA
5.5 V
“
“
“
“
2.0 V
5.5 V
“
“
“
“
0.8 V
3
Same tests, terminal conditions and limits as for subgroup 1, except TA = -55°C and VIC tests are omitted.
5.5 V
5.5 V
“
“
2.0 V
5.5 v
5.5 V
“
“
“
0.8 V
5.5 V
GND
GND
“
“
“
2.4 V
GND
“
“
“
“
5.5 V
GND
5.5 V
“
“
“
0.4 V
5.5 V
5.5 V
GND
-12 mA
20 mA
-.5 mA
GND
GND
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
GND
“
“
“
“
“
GND
“
“
“
“
“
GND
“
“
“
“
“
GND
“
GND
“
“
“
“
“
-.5 mA
-.5 mA
GND
GND
GND
GND
“
“
“
“
2.4 V
GND
“
“
“
“
5.5 V
5.5 V
“
“
“
“
0.4 V
5.5 V
GND
-12 mA
Measured
terminal
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
VCC
VCC
1A
2A
3A
4A
5A
6A
Min
2.4
“
“
“
“
“
-40
“
“
“
-1.0
“
“
“
“
“
Max
Unit
0.4
“
“
“
“
“
-100
“
“
“
V
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
50
“
“
“
“
“
100
“
“
“
“
“
-2.0
“
“
“
“
“
60
26
-1.5
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
mA
mA
V
“
“
“
“
“
MIL-M-38510/23D
2
1
2.0 V
5.5 V
4.5 V
5.5 V
5.5 V
2
5.5 V
20 mA
2.0 V
“
5.5 V
“
3
“
5.5 V
“
2.0 V
20 mA
“
4
“
“
“
5.5 V
2.0 V
20 mA
5
“
“
“
5.5 V
6
“
“
“
“
VOH
7
0.8 V
5.5 V
4.5 V
5.5 V
8
5.5 V
-.5 mA
0.8 V
“
“
9
“
5.5 V
“
0.8 V
-.5 mA
“
10
“
“
5.5 V
0.8 V
-.5 mA
11
“
“
5.5 V
12
“
“
5.5 V
IOS
13
GND
5.5 V
14
GND
GND
“
15
“
GND
GND
16
“
GND
GND
17
“
18
“
IIH1
19
2.4 V
GND
5.5 V
GND
GND
20
GND
2.4 V
“
GND
“
21
“
GND
“
2.4 V
“
22
“
“
“
GND
2.4 V
23
“
“
“
“
GND
24
“
“
“
“
“
II H 2
25
5.5 V
GND
5.5 V
GND
“
26
GND
5.5 V
“
GND
“
27
“
GND
“
5.5 V
“
28
“
“
“
“
5.5 V
29
“
“
“
“
GND
30
“
“
“
“
“
II L
31
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
32
5.5 V
0.4 V
“
“
“
33
“
5.5 V
“
0.4 V
“
34
“
“
“
5.5 V
0.4 V
35
“
“
“
“
5.5 V
36
“
“
“
“
“
ICCL
37
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
38
GND
GND
5.5 V
GND
GND
VIC
39
-12 mA
4.5 V
40
-12 mA
“
41
“
-12 mA
42
“
-12 mA
43
“
44
“
Same tests, terminal conditions and limits as for subgroup 1, except TA = +125°C and VIC tests are omitted.
20
3007
“
“
“
“
“
3006
“
“
“
“
“
3011
“
“
“
“
“
3010
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
3005
3005
Limits
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
9
MIL-STDSymbol
883
method
tPHL
TA = +25°C
tPLH
10
tPHL
TA = +125°C
21
11
tPHL
TA = -55°C
tPLH
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
4
3
14
5
6
9
8
11
10
7
12
13
2
1A
2Y
2A
VCC
3A
3Y
24A
4Y
5A
5Y
GND
6Y
6A
1Y
IN
5.0 V
GND
OUT
IN
“
“
IN
“
“
“
“
5.0 V
“
“
“
“
“
5.0 V
“
“
“
“
GND
“
“
“
“
“
GND
3003
45
(Fig. 3)
46
“
“
“
“
3003
(Fig. 3)
“
“
“
“
3003
47
48
49
50
51
52
53
54
55
56
57
(Fig. 3)
58
“
“
“
“
3003
59
60
61
62
63
(Fig. 3)
64
“
65
“
“
66
“
“
67
“
IN
OUT
IN
OUT
IN
OUT
IN
“
68
69
(Fig. 3)
70
“
71
“
“
72
“
“
73
“
“
74
3003
75
(Fig. 3)
76
“
77
OUT
IN
IN
OUT
IN
IN
OUT
IN
IN
OUT
OUT
IN
OUT
IN
OUT
IN
OUT
IN
OUT
IN
OUT
“
3003
IN
OUT
“
“
“
“
“
5.0 V
IN
IN
IN
OUT
IN
OUT
IN
OUT
Measured
terminal
Min
Max
Unit
1A to 1Y
2
12
ns
2A to 2Y
“
“
“
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
“
“
“
“
2
“
“
“
“
“
“
12
“
“
2
14
“
“
“
“
“
“
“
“
“
“
ns
“
2A to 2Y
“
“
“
“
“
“
“
GND
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
“
“
“
“
2
“
“
“
“
15
“
“
“
“
“
“
78
“
“
79
“
“
80
“
IN
OUT
IN
OUT
OUT
“
“
4A to 4Y
“
“
“
5A to 5Y
“
“
“
“
OUT
IN
OUT
6A to 6Y
“
“
“
1A to 1Y
2
16
ns
2A to 2Y
“
“
“
“
3A to 3Y
“
“
“
“
4A to 4Y
“
“
“
5A to 5Y
“
“
“
“
“
OUT
IN
“
GND
IN
OUT
“
“
“
OUT
“
5.0 V
“
IN
“
“
OUT
OUT
“
“
IN
OUT
3A to 3Y
“
OUT
IN
2A to 2Y
GND
IN
OUT
“
“
OUT
OUT
“
5.0 V
IN
Limits
OUT
IN
OUT
6A to 6Y
“
“
“
1A to 1Y
2
13
“
“
2A to 2Y
“
“
“
“
3A to 3Y
“
“
“
“
4A to 4Y
“
“
“
“
5A to 5Y
“
“
“
6A to 6Y
“
“
“
“
OUT
IN
MIL-M-38510/23D
tPLH
Cases
A,B,D
Case
C
Test no.
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
TA = +25°C
VO L
“
“
“
ICEX
3007
“
“
“
Cases
A,B,D
Case
C
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
2
3
14
6
4
5
8
9
10
7
12
13
11
1A
1B
1Y
VCC
2Y
2A
2B
3Y
3A
3B
GND
4A
4B
4Y
5.5 V
5.5 V
2.0 V
5.5 V
5.5 V
“
“
“
0.8 V
4.5 V
5.5 V
5.5 V
5.5 V
5.5 V
2.0 V
5.5 V
5.5 V
“
“
“
4.5 V
0.8 V
5.5 V
5.5 V
GND
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
5.5 V
“
“
2.0 V
5.5 V
“
“
“
“
“
0.8 V
4.5 V
5.5 V
“
“
2.0 V
5.5 V
“
“
“
“
“
4.5 V
0.8 V
1
2.0 V
2.0 V
20 mA
4.5 V
5.5 V
5.5 V
2
5.5 V
5.5 V
“
20 mA
2.0 V
2.0 V
3
“
“
“
5.5 V
5.5 V
20 mA
4
“
“
“
“
“
5
0.8 V
4.5 V
5.5 V
4.5 V
5.5 V
5.5 V
6
4.5 V
0.8 V
5.5 V
“
“
“
7
5.5 V
5.5 V
“
5.5 V
0.8 V
4.5 V
8
“
“
“
5.5 V
4.5 V
0.8 V
9
“
“
“
5.5 V
5.5 V
5.5 V
10
“
“
“
“
“
5.5 V
11
“
“
“
“
“
12
“
“
“
“
“
VIC
13
-12 mA
4.5 V
14
-12 mA
“
15
“
-12 mA
16
“
-12 mA
17
“
18
“
19
“
20
“
IIH1
3010
21
2.4 V
GND
5.5 V
GND
GND
“
22
GND
2.4 V
“
GND
“
“
23
“
GND
“
2.4 V
“
“
24
“
“
“
GND
2.4 V
“
25
“
“
“
“
GND
“
26
“
“
“
“
“
“
27
“
“
“
“
“
“
28
“
“
“
“
“
II H 2
“
29
5.5 V
GND
5.5 V
“
“
“
30
GND
5.5 V
“
“
“
“
31
“
GND
“
5.5 V
“
“
32
“
“
“
GND
5.5 V
“
33
“
“
“
“
GND
“
34
“
“
“
“
“
“
35
“
“
“
“
“
“
36
“
“
“
“
“
II L
3009
37
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
“
38
5.5 V
0.4 V
“
“
“
“
39
“
5.5 V
“
0.4 V
“
“
40
“
“
“
5.5 V
0.4 V
“
41
“
“
“
“
5.5 V
“
42
“
“
“
“
“
“
43
“
“
“
“
“
“
44
“
“
“
“
“
ICCH
3005
45
GND
GND
5.5 V
GND
GND
ICCL
3005
46
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
Same tests, terminal conditions and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
-12 mA
-12 mA
-12 mA
GND
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
5.5 V
“
“
“
0.4 V
5.5 V
“
“
GND
5.5 V
GND
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
GND
“
5.5 V
“
“
“
“
0.4 V
5.5 V
“
GND
5.5 V
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
5.5 V
GND
“
“
“
“
“
2.4 V
GND
GND
“
“
“
“
“
5.5 V
GND
5.5 V
“
“
“
“
“
0.4 V
5.5 V
GND
5.5 V
-12 mA
GND
“
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
5.5 V
“
“
“
“
“
“
0.4 V
GND
5.5 V
20 mA
5.5 V
5.5 V
Limits
Measured
terminal
1Y
2Y
3Y
4Y
1Y
1Y
2Y
2Y
3Y
3Y
4Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
VCC
VCC
Min
-1.0
“
“
“
“
“
“
“
Max
Unit
0.4
“
“
“
250
“
“
“
“
“
“
“
-1.5
“
“
“
“
“
“
“
50
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
-2.0
“
“
“
“
“
“
“
16.8
40
V
“
“
“
µA
“
“
“
“
“
“
“
V
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
mA
mA
MIL-M-38510/23D
22
2
3
MIL-STDSymbol
883
method
TABLE III. Group A inspection for device type 06 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
9
MIL-STDSymbol
883
method
tPHL
TA = +25°C
tPLH
10
tPHL
TA = +125°C
tPLH
tPHL
TA = -55°C
tPLH
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
2
3
14
6
4
5
8
9
10
7
12
13
11
1A
1B
1Y
VCC
2Y
2A
2B
3Y
3A
3B
GND
4A
4B
4Y
IN
2.4 V
OUT
5.0 V
OUT
IN
2.4 V
3003
47
(Fig. 4)
48
“
“
“
3003
(Fig. 4)
“
“
3003
49
50
51
52
53
54
55
OUT
OUT
“
“
5.0 V
“
“
“
5.0 V
OUT
OUT
IN
IN
2.4 V
2.4 V
OUT
(Fig. 4)
56
“
“
“
3003
57
58
59
“
“
5.0 V
IN
2.4 V
OUT
IN
2.4 V
IN
2.4 V
Min
Max
Unit
GND
1A to 1Y
3
14
ns
“
2A to 2Y
“
“
“
“
“
GND
“
“
“
GND
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
“
“
3
“
“
“
3
“
“
17
“
“
“
16
“
“
“
“
“
“
ns
IN
2.4 V
OUT
IN
2.4 V
OUT
“
2A to 2Y
“
“
“
“
“
GND
3A to 3Y
4A to 4Y
1A to 1Y
“
“
3
“
“
21
“
“
“
IN
2.4 V
OUT
60
“
“
61
“
“
62
“
“
4A to 4Y
“
“
“
3003
63
5.0 V
GND
1A to 1Y
3
18
ns
“
2A to 2Y
“
“
“
“
3A to 3Y
“
“
“
2.4 V
OUT
2.4 V
Measured
terminal
(Fig. 4)
IN
IN
IN
2.4 V
OUT
OUT
2.4 V
2.4 V
OUT
IN
IN
Limits
OUT
2A to 2Y
“
“
“
“
3A to 3Y
“
“
“
IN
2.4 V
OUT
64
“
65
“
“
66
“
“
4A to 4Y
“
“
“
3003
67
5.0 V
GND
1A to 1Y
3
19
“
(Fig. 4)
68
“
2A to 2Y
“
“
“
3A to 3Y
“
“
“
6A to 6Y
“
“
“
OUT
“
“
69
“
“
70
“
2.4 V
“
“
2.4 V
IN
2.4 V
(Fig. 4)
IN
OUT
IN
OUT
OUT
IN
IN
2.4 V
2.4 V
OUT
IN
2.4 V
IN
2.4 V
OUT
“
“
IN
2.4 V
OUT
MIL-M-38510/23D
23
11
Cases
A,B,D
Case
C
Test no.
TABLE III. Group A inspection for device type 07.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
1
TA = +25°C
MIL-STDSymbol
883
method
VO L
“
3007
“
Cases
A,B,D
Case
C
Test no.
1
2
2
3
4
5
6
7
8
9
10
11
12
13
14
1
6
3
14
11
9
10
12
13
8
7
2
4
5
1A
1Y
NC
VCC
NC
2A
2B
2C
2D
2Y
GND
1B
1C
1D
2.0 V
5.5 V
20 mA
5.5 V
2.0 V
5.5 V
2.0 V
5.5 V
2.0 V
5.5 V
2.0 V
20 mA
GND
“
2.0 V
5.5 V
2.0 V
5.5 V
2.0 V
5.5 V
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
GND
GND
5.5 V
0.8 V
5.5 V
“
“
“
“
“
5.5 V
5.5 V
0.8 V
5.5 V
“
“
“
“
5.5 V
5.5 V
5.5 V
0.8 V
5.5 V
“
“
“
4.5 V
“
ICEX
3
Same tests, terminal conditions and limits as for subgroup 1, except TA = -55°C and VIC tests are omitted.
24
2
3
0.8 V
5.5 V
4.5 V
5.5 V
5.5 V
5.5 V
4
5.5 V
“
“
“
“
“
5
5.5 V
“
“
“
“
“
6
“
5.5 V
“
“
“
“
7
“
“
0.8 V
“
“
8
“
“
5.5 V
0.8 V
“
9
“
“
“
5.5 V
0.8 V
10
“
“
“
5.5 V
5.5 V
VIC
11
-12 mA
4.5 V
12
“
13
“
14
“
15
“
-12 mA
16
“
-12 mA
17
“
-12 mA
18
“
IIH1
3010
19
2.4 V
5.5 V
GND
GND
GND
“
20
GND
“
“
“
“
“
21
“
“
“
“
“
“
22
“
“
“
“
“
“
23
“
“
2.4 V
“
“
“
24
“
“
GND
2.4 V
“
“
25
“
“
“
GND
2.4 V
“
26
“
“
“
GND
GND
II H 2
“
27
5.5 V
5.5 V
GND
GND
GND
“
28
GND
“
“
“
“
“
29
“
“
“
“
“
“
30
“
“
“
“
“
“
31
“
“
5.5 V
“
“
“
32
“
“
GND
5.5 V
“
“
33
“
“
“
GND
5.5 V
“
34
“
“
“
GND
GND
II L
3009
35
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
“
36
5.5 V
“
“
“
“
“
37
“
“
“
“
“
“
38
“
“
“
“
“
“
39
“
“
0.4 V
“
“
“
40
“
“
5.5 V
0.4 V
“
“
41
“
“
“
5.5 V
0.4 V
“
42
“
“
“
“
5.5 V
ICCL
3005
43
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
44
GND
5.5 V
GND
GND
GND
Same tests, terminal conditions and limits as for subgroup 1, except TA = +125°C and VIC tests are omitted.
5.5 V
“
“
“
“
“
“
0.8 V
-12 mA
GND
“
“
“
“
“
“
2.4 V
GND
“
“
“
“
“
“
5.5 V
5.5 V
“
“
“
“
“
“
0.4 V
5.5 V
GND
5.5 V
“
“
“
-12 mA
-12 mA
-12 mA
GND
2.4 V
GND
“
“
“
“
“
GND
5.5 V
GND
“
“
“
“
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
5.5 V
GND
GND
“
2.4 V
GND
“
“
“
“
GND
“
5.5 V
GND
“
“
“
“
5.5 V
“
0.4 V
5.5 V
“
“
“
“
5.5 V
GND
GND
“
“
2.4 V
GND
“
“
“
GND
“
“
5.5 V
GND
“
“
“
5.5 V
“
“
0.4 V
5.5 V
“
“
“
5.5 V
GND
Limits
Measured
terminal
Max
Unit
1Y
2Y
0.4
“
V
“
1Y
1Y
1Y
1Y
2Y
2Y
2Y
2Y
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
VCC
VCC
250
“
“
“
“
“
“
“
-1.5
“
“
“
“
“
“
“
50
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
-2.0
“
“
“
“
“
“
“
20
8.4
µA
“
“
“
“
“
“
“
V
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
mA
mA
Min
-1.0
“
“
“
“
“
“
“
MIL-M-38510/23D
1
TABLE III. Group A inspection for device type 07 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V, or open)
Subgroup
9
TA = +25°C
10
TA = +125°C
11
TA = -55°C
MIL-STDSymbol
883
method
Cases
A,B,D
Case
C
Test no.
tPHL
3003
45
tPHL
(Fig. 4)
46
tPLH
tPLH
tPHL
tPHL
tPLH
tPLH
tPHL
tPHL
tPLH
tPLH
“
“
3003
(Fig. 4)
“
“
3003
(Fig. 4)
47
48
49
50
51
52
53
54
55
56
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
6
3
14
11
9
10
12
13
8
7
2
4
5
1A
1Y
NC
VCC
NC
2A
2B
2C
2D
2Y
GND
1B
1C
1D
IN
OUT
GND
2.4 V
2.4 V
2.4 V
IN
2.4 V
2.4 V
2.4 V
OUT
5.0 V
“
IN
OUT
IN
OUT
IN
IN
IN
OUT
OUT
OUT
“
“
5.0 V
“
“
“
5.0 V
“
“
“
“
“
“
GND
“
IN
2.4 V
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
2.4 V
OUT
“
“
GND
“
IN
2.4 V
2.4 V
2.4 V
OUT
“
“
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
Limits
Measured
terminal
Min
Max
Unit
1A to 1Y
3
14
ns
2A to 1Y
“
14
“
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
“
“
3
“
“
“
3
“
“
“
17
17
16
16
21
21
18
18
19
19
“
“
“
“
“
“
“
“
“
“
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
MIL-M-38510/23D
25
MIL-M-38510/23D
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a.
End point electrical parameters shall be as specified in table II herein.
b.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical
parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.
4.5.1 Voltage and current. All voltage values given are referenced to the microcircuit ground terminals. Currents given are
conventional current and positive when flowing into the referenced terminal.
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or
order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these personnel need to contact the
responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the
Inventory Control Point's packaging activity within the Military Department of Defense Agency, or within the Military Department's
System Command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's
automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
26
MIL-M-38510/23D
6. NOTES
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and
logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
Complete part number (see 1.2).
c.
Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to acquiring activity in addition to
notification of the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of MIL-STD-883, method 5003),
corrective action and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not
affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by
or direct shipment to the Government.
j.
Requirements for "JAN" marking.
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in
this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this
specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid
adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the
time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have
actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are
urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that
they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information
pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-STD-1331, and as follows:.
GND ................................................ Ground zero voltage potential.
VIN ................................................. Voltage level at an input terminal
VIC ................................................. Input clamp voltage
IIN ................................................. Current flowing into an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits
acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4).
Longer length leads and lead forming should not affect the part number.
27
MIL-M-38510/23D
6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered
by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have
equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M38510 device types and may have slight physical variations in relation to case size. The presence of this information should not
be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of
MIL-PRF-38535.
Military device type
01
02
03
04
05
06
07
Generic-industry type
54H30
54H20
54H10
54H00
54H04
54H01
54H22
6.8 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous
issue, due to the extensiveness of the changes.
Custodians:
Army – CR
Navy - EC
Air Force - 11
NASA - NA
DLA – CC
Preparing activity:
DLA - CC
Project 5962-1978
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force – 03, 19, 99
28
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
INSTRUCTIONS
1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision letter should be given.
2. The submitter of this form must complete blocks 4, 5, 6, and 7, and send to preparing activity.
3. The preparing activity must provide a reply within 30 days from receipt of the form.
NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of requirements on current contracts.
Comments submitted on this form do not constitute or imply authorization to waive any portion of the referenced document(s) or to amend
contractual requirements.
I RECOMMEND A CHANGE:
1. DOCUMENT NUMBER
MIL-M-38510/23D
2. DOCUMENT DATE (YYYYMMDD)
2003/07/11
3. DOCUMENT TITLE
MICROCIRCUITS, DIGITAL, TTL, HIGH SPEED, NAND GATES, MONOLITHIC SILICON, PART NUMBER M38510/2301 THROUGH
M38510/2307
4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)
5. REASON FOR RECOMMENDATION
6. SUBMITTER
a. NAME (Last, First Middle Initial)
c. ADDRESS (Include Zip Code)
8. PREPARING ACTIVITY
a. NAME
Rick Officer
c. ADDRESS (Include Zip Code)
DSCC-VAS
3990 East Broad Street
Columbus, Ohio 43216-5000
DD Form 1426, FEB 1999 (EG)
Feb 99
b. ORGANIZATION
d. TELEPHONE (Include Area Code)
(1) Commercial
(2) DSN
(If applicable)
7. DATE SUBMITTED
(YYYYMMDD)
b. TELEPHONE (Include Area Code
(1) Commercial
(2) DSN
614-692-0518
850-0518
IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT:
Defense Standardization Program Office (DLSC-LM)
8725 John J. Kingman Road, Suite 2533
Fort Belvoir, Virginia 22060-6221
Telephone (703)767-6888 DSN 427-6888
PREVIOUS EDITIONS ARE OBSOLETE.
WHS/DIOR,
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