Download datasheet for 54LS03/BCA by Rochester Electronics

Download datasheet for 54LS03/BCA by Rochester Electronics
INCH-POUND
MIL-M-38510/300E
7 JANUARY 2003_
SUPERSEDING
MIL-M-38510/300D
15 JULY 1987
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, BIPOLAR LOW-POWER SCHOTTKY TTL, AND GATES,
MONOLITHIC SILICON
Inactive for new design after 18 April 1997.
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL,
positive NAND logic gate microcircuits. Two product assurance classes and a choice of case outlines and lead
finishes are provided for each type and are reflected in the complete part number. For this product, the requirements
of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3).
1.2 Part number. The part number shall be in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types shall be as follows:
Device type
01
02
03
04
05
06
07
08
09
Circuit
Quadruple, 2-input positive NAND gate
Quadruple, 2-input positive NAND gate (open collector output)
Hex, 1-input inverter gate
Hex, 1-input inverter gate (open collector output)
Triple, 3-input positive NAND gate
Triple, 3-input positive NAND gate (open collector output)
Dual, 4-input positive NAND gate
Dual, 4-input positive NAND gate (open collector output)
Single, 8-input positive NAND gate
1.2.2 Device class. The device class shall be the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines shall be as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
A
B
C
D
X
2
GDFP5-F14 or CDFP6-F14
GDFP4-14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
CQCC2-N20
CQCC1-N20
14
14
14
14
20
20
Package style
Flat pack
Flat pack
Dual-in-line
Flat pack
Square leadless chip carrier
Square leadless chip carrier
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in
improving this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN:
DSCC-VAS, 3990 East Broad St., Columbus, OH 43216-5000, by using the self addressed Standardization
Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
AMSC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5962
MIL-M-38510/300E
1.3 Absolute maximum ratings.
Supply voltage range .............................................................................
Input voltage range ................................................................................
Storage temperature range ....................................................................
Maximum power dissipation, (PD) 1/ ......................................................
Lead temperature (soldering, 10 seconds) .............................................
Thermal resistance, junction to case (θJC):
Cases A, B, C, D, X, and 2 ..................................................................
Junction temperature (TJ) .......................................................................
-0.5 V to +7.0 V
-1.5 V at -18 mA to +5.5 V
-65° to +150°C
6.1 mW dc
300°C
(See MIL-STD-1835)
175°C 2/
1.4 Recommended operating conditions.
Supply voltage (VCC) .............................................................................. 4.5 V dc minimum to 5.5 V dc
maximum
Minimum high level input voltage (VIH) ................................................... 2.0 V
Maximum low level input voltage (VIL) .................................................... 0.7 V
Case operating temperature range (TC) ................................................. -55° to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications and Standards. The following specifications and standards form a part of this specification to
the extent specified herein. Unless otherwise specified, the issues of these documents shall be those listed in the
issue of the Departments of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited
in the solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
MIL-STD-1835
-
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outlines
(Unless otherwise indicated, copies of the above specifications and standards are available from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature (TJ) may be increased during the burn-in screening and steady-state life
test. However, such temperatures should not be used under normal operating conditions.
2
MIL-M-38510/300E
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be
as specified in MIL-PRF-38535 and herein.
3.3.1 Logic diagrams and terminal connections. The logic diagrams and terminal connections shall be as
specified on figure 1.
3.3.2 Truth tables. The truth tables and logic equations shall be as specified on figure 2.
3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying activity and the preparing activity (DSCC-VAS) upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I,
and apply over the full recommended case operating temperature range, unless otherwise specified.
3.5.1 Post-irradiation performance characteristics. The electrical performance characteristics of radiation
hardness assured devices following exposure to the designated radiation levels are as specified in table III,
subgroups 1 and 9 and apply at an ambient temperature of +25°C.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 8 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535
or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall
not effect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior
to qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
3
MIL-M-38510/300E
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
-55°C ≤ TC ≤ +125°C
Device
types
Limits
Min
Unit
Max
High level output
voltage
VOH
VCC = 4.5 V, VIL = 0.7 V;
IOH = -400 µA
01, 03, 05
07, 09
2.5
V
Low level output
voltage
VOL
VCC = 4.5 V, IOL = 4 mA;
VIH = 2.0 V
All
0.4
V
Input clamp voltage
VIC
VCC = 4.5 V, IIN = -18 mA;
All
-1.5
V
Collector cut-off
current
ICEX
High level input
current
TC = +25°C
Low level input
current
VCC = 4.5 V, VIL = 0.7 V;
100
µA
VOH = 5.5 V
08
IIH1
VCC = 5.5 V, VIN = 2.7 V
All
20
µA
IIH2
VCC = 5.5 V, VIN = 5.5 V
All
100
µA
IIL
VCC = 5.5 V, VIL = 0.4 V
01, 02, 03
04, 05, 06
-30
-400
µA
07
-30
-380
08
-30
-440
09
0
-400
-15
-100
Short circuit output
current
IOS
VCC = 5.5 V 1/
High level supply
current
ICCH
VCC = 5.5 V, VIN = 0 V
Low level supply
current
02, 04, 06
ICCL
Propagation delay time tPHL
high-to-low level
Propagation delay time tPLH
low-to-high level
01, 03, 05
07, 09
VCC = 5.5 V, VIN = 5.5 V
01, 02
1.6
03, 04
2.4
05
1.2
06
1.4
07, 08
0.8
09
0.5
01, 02
4.4
03, 04
6.6
05, 06
3.3
07, 08
2.2
09
1.1
CL = 50 pF
RL = 2 kΩ
01, 03, 05,
07
2
24
VCC = 5.0 V
02, 04, 06,
08
2
55
09
2
38
CL = 50 pF
RL = 2 kΩ
01, 03, 05,
07
2
20
VCC = 5.0 V
02, 04, 06,
08
2
50
09
2
32
1/ Not more than one output should be shorted at a time.
4
mA
mA
mA
ns
ns
MIL-M-38510/300E
TABLE II. Electrical test requirements.
MIL-PRF-38535 test requirements
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Group C end-point electrical parameters
Group D end-point electrical parameters
Subgroups (see table III)
Class S
Class B
devices
devices
1
1
1*, 2, 3, 9,
10, 11
1, 2, 3,
9, 10, 11
1, 2, 3, 5
9, 10, 11
1, 2, 3
1*, 2, 3, 9
1, 2, 3, 9,
10, 11
1, 2, 3
1, 2, 3
*PDA applies to subgroup 1.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be
as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given
are conventional and positive when flowing into the referenced terminal.
5
MIL-M-38510/300E
FIGURE 1. Logic diagrams and terminal connections (top view).
6
MIL-M-38510/300E
FIGURE 1. Logic diagrams and terminal connections (top view) - Continued.
7
MIL-M-38510/300E
FIGURE 1. Logic diagrams and terminal connections (top view) - Continued.
8
MIL-M-38510/300E
Device types 01 and 02
Device types 03 and 04
Truth table each gate
Input
Output
A
B
Y
L
H
L
H
L
L
H
H
Truth table each gate
Input
Output
A
Y
H
H
H
L
L
H
H
L
Positive logic Y = A
Positive logic Y = AB
Device types 07 and 08
Device types 05 and 06
A
L
H
L
H
L
H
L
H
A
Truth table each gate
Input
Output
B
C
Y
L
L
H
H
L
L
H
H
L
L
L
L
H
H
H
H
H
H
H
H
H
H
H
L
Positive logic Y = ABC
Truth table each gate
Input
Output
B
C
D
Y
L
H
L
H
L
L
H
H
L
L
L
L
L
L
L
L
H
H
H
H
L
H
L
H
L
H
L
H
L
H
L
L
H
H
L
L
H
H
L
L
H
H
H
H
L
L
L
L
H
H
L
L
L
L
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
L
H
H
H
H
H
H
H
H
L
Positive logic Y = ABCD
Device type 09
A
B
C
Truth table
Inputs
D
E
F
G
H
H
H
H
H
H
H
H
H
All other combinations of H and L at the inputs
give H output.
Positive logic Y = ABCDEFGH
FIGURE 2. Truth table and logic equations.
9
Output
Y
L
MIL-M-38510/300E
Device types 01 thru 09
NOTES:
1. The pulse generator has the following characteristics:
t1 ≤ 15 ns, t0 ≤ 6 ns, PRR ≤ 1 MHz, duty cycle = 50% and ZOUT = 50Ω.
2. Inputs not under test are at 2.7 V.
3. CL = 50 pF ±10%, including scope probe, wiring, and stray capacitance.
4. RL = 2 kΩ ±5%.
5. Voltage measurements are to be made with respect to network ground terminal.
FIGURE 3. Switching time test circuit and waveforms for device types 01 through 09.
10
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
1
Tc = 25°C
VOH
VOL
MIL-STD883
method
3006
"
"
"
"
"
"
"
3007
"
"
"
VIC
11
IIH2
IIL
IOS
3010
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3009
"
"
"
"
"
"
"
3011
"
"
"
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
3
4
6
8
9
10
12
13
14
16
18
19
20
1A
5.5 V
0.7 V
5.5 V
"
"
"
"
"
2.0 V
GND
"
"
-18 mA
1B
0.7 V
5.5 V
"
"
"
"
"
"
2.0 V
GND
"
"
1Y
-400 µA
-400 µA
2A
5.5 V
"
"
0.7 V
5.5 V
"
"
"
GND
2.0 V
GND
GND
2B
5.5 V
5.5 V
0.7 V
5.5 V
"
"
"
"
GND
2.0 V
GND
GND
2Y
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3Y
3A
5.5 V
"
"
"
"
0.7 V
5.5 V
5.5 V
GND
GND
2.0 V
GND
3B
5.5 V
"
"
"
0.7 V
5.5 V
"
"
GND
GND
2.0 V
GND
4Y
4A
5.5 V
"
"
"
"
"
"
0.7 V
GND
"
"
2.0 V
4B
5.5 V
"
"
"
"
"
0.7 V
5.5 V
GND
"
"
2.0 V
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
4 mA
-400 µA
-400 µA
4mA
-18 mA
-18 mA
-18mA
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
"
"
"
"
0.4 V
5.5 V
"
"
"
"
"
"
GND
See footnotes at end of device type 01
GND
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
"
"
"
5.5 V
0.4 V
5.5 V
"
"
"
"
"
GND
GND
GND
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
"
"
5.5 V
5.5 V
0.4 V
5.5 V
"
"
"
"
GND
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
"
5.5 V
"
"
0.4 V
5.5 V
"
"
"
GND
GND
GND
GND
-400 µA
-400 µA
4 mA
-400 µA
-400 µA
4 mA
-18 mA
-18 mA
-18 mA
GND
GND
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
0.4 V
5.5 V
"
"
GND
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
GND
5.5 V
"
"
"
"
0.4 V
5.5 V
"
GND
GND
GND
GND
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
-18 mA
GND
"
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
0.4 V
GND
GND
Measured
terminal
1Y
1Y
2Y
2Y
3Y
3Y
4Y
4Y
1Y
2Y
3Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1Y
2Y
3Y
4Y
Limits
Min
2.5
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
3/
"
"
"
Unit
Max
0.4
"
"
"
-1.5
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
3/
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
"
"
"
MIL-M-38510/300E
IIH1
Cases
A,B,C,D
Case 1/
X and 2
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
MIL-STD883
method
1
Tc = 25°C
2
3
9
Tc = 25°C
IC C H
IC C L
3005
3005
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Case 1/
X and 2
Test no.
49
50
2
3
4
6
8
9
10
12
13
14
16
18
19
20
1A
GND
5.5 V
1B
GND
5.5 V
1Y
2A
GND
5.5 V
2B
GND
5.5 V
2Y
GND
GND
“
3Y
3A
GND
5.5 V
3B
GND
5.5 V
4Y
4A
GND
5.5 V
4B
GND
5.5 V
VCC
5.5 V
5.5 V
VC C
VC C
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2.7 V
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
tPHL
3003
51
IN
2.7 V
OUT
2.7 V
2.7 V
GND
Fig. 3
52
2.7 V
IN
OUT
2.7 V
"
“
"
53
"
2.7 V
IN
"
OUT
“
"
54
"
"
2.7 V
IN
OUT
“
"
55
"
"
"
2.7 V
“
OUT
"
56
"
"
"
"
“
OUT
"
57
"
"
"
"
“
"
58
"
"
"
"
“
tPLH
"
59
IN
"
OUT
"
"
“
"
60
2.7 V
IN
OUT
"
"
“
"
61
"
2.7 V
IN
"
OUT
“
"
62
"
"
2.7 V
IN
OUT
“
"
63
"
"
"
2.7 V
“
OUT
"
64
"
"
"
"
“
OUT
"
65
"
"
"
"
“
"
66
"
"
"
"
“
10
tPHL
"
67
IN
2.7 V
OUT
"
"
"
"
68
2.7 V
IN
OUT
"
"
“
Tc = 125°C
"
69
"
2.7 V
IN
"
OUT
“
"
70
"
"
2.7 V
IN
OUT
“
"
71
"
"
"
2.7 V
“
OUT
"
72
"
"
"
"
“
OUT
"
73
"
"
"
"
“
"
74
"
"
"
"
“
tPLH
"
75
IN
"
OUT
"
"
“
"
76
2.7 V
IN
OUT
"
"
“
"
77
"
2.7 V
IN
"
OUT
“
"
78
"
"
2.7 V
IN
OUT
“
"
79
"
"
"
2.7 V
“
OUT
"
80
"
"
"
"
“
OUT
"
81
"
"
"
"
“
"
82
"
"
"
"
“
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Measured terminal
Min/max limits for circuit
A
-120/-360
B
-30/-300
C
1A, 1B, 2A, 2B,
-150/-360
3A, 3B, 4A, 4B
3/ IOS limits for circuit C: -20/-100; for circuits A, B, D, E, and F: -15/-100.
D
-160/-400
E
-150/-380
F
-100/-340
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
Measured
terminal
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Unit
Max
1.6
4.4
mA
“
17
“
“
“
“
“
“
“
15
"
“
“
“
“
“
“
24
“
“
“
“
“
“
“
20
"
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
12
Cases
A,B,C,D
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
1
Tc = 25°C
VO L
MIL-STD883
method
3007
"
"
"
ICEX
VI C
13
II H 2
II L
3010
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3009
"
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
3
4
6
8
9
10
12
13
14
16
18
19
20
1A
2.0 V
GND
“
“
0.7 V
5.5 V
“
“
“
"
"
“
-18 mA
1B
2.0 V
GND
"
“
5.5 V
0.7 V
5.5 V
“
“
“
"
"
1Y
4 mA
2A
GND
2.0 V
GND
GND
5.5 V
5.5 V
0.7 V
5.5 V
“
“
“
“
2B
GND
2.0 V
GND
GND
5.5 V
"
"
0.7 V
5.5 V
“
“
“
2Y
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
3Y
3A
GND
GND
2.0 V
GND
5.5 V
“
"
"
0.7 V
5.5 V
“
“
3B
GND
GND
2.0 V
GND
5.5 V
“
“
"
"
0.7 V
5.5 V
5.5 V
4Y
4A
GND
“
“
2.0 V
5.5 V
"
"
"
"
"
0.7 V
5.5 V
4B
GND
"
"
2.0 V
5.5 V
“
“
“
“
“
“
0.7 V
VCC
4.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
5.5 V
5.5 V
-18 mA
-18 mA
-18 mA
2.7 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
“
0.4 V
5.5 V
“
“
“
“
“
“
See footnotes at end of device type 02
GND
2.7 V
GND
“
“
“
“
“
“
5.5 V
GND
“
“
“
“
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
GND
GND
2.7 V
GND
"
"
"
"
“
“
5.5 V
GND
"
"
“
“
5.5 V
5.5 V
0.4 V
5.5 V
"
"
“
“
GND
“
“
2.7 V
GND
"
"
“
“
“
“
5.5 V
GND
"
"
"
5.5 V
“
“
0.4 V
5.5 V
"
"
"
4 mA
5.5 V
5.5 V
4 mA
5.5 V
5.5 V
4 mA
5.5 V
5.5 V
-18 mA
-18 mA
-18 mA
GND
“
“
“
2.7 V
GND
"
"
“
“
“
“
5.5 V
GND
"
"
5.5 V
“
“
“
0.4 V
5.5 V
"
"
GND
“
“
“
“
2.7 V
GND
"
“
“
“
“
“
5.5 V
GND
GND
5.5 V
“
“
“
“
0.4 V
5.5 V
"
GND
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
-18 mA
GND
"
"
"
"
"
"
2.7 V
GND
“
"
"
“
“
“
5.5 V
"
"
"
"
"
"
"
0.4 V
Measured
terminal
Limits
Min
1Y
2Y
3Y
4Y
1Y
1Y
2Y
2Y
3Y
3Y
4Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
2/
“
“
“
“
“
“
“
Max
0.4
“
“
“
100
“
“
“
“
"
“
“
-1.5 V
“
“
“
“
“
"
“
20
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
2/
“
“
“
“
“
“
“
Unit
V dc
“
“
“
µA
“
“
“
“
“
"
“
V
“
“
“
“
“
"
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
MIL-M-38510/300E
II H 1
Cases
A,B,C,D
Case 1/
X and 2
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
TABLE III. Group A inspection for device type 02 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
MIL-STDSymbol
883
method
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Case 1/
X and 2
Test no.
45
46
2
3
4
6
8
9
10
12
13
14
16
18
19
20
3A
5.5 V
GND
3B
5.5 V
GND
4Y
4A
5.5 V
GND
4B
5.5 V
GND
VCC
5.5 V
5.5 V
VC C
VC C
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2.7 V
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A to 1Y
1B to 1Y
2A to 2Y
2B to 2Y
3A to 3Y
3B to 3Y
4A to 4Y
4B to 4Y
1A
1B
1Y
2A
2B
2Y
GND
3Y
1
IC C L
3005
5.5 V
5.5 V
5.5 V
5.5 V
GND
3005
GND
GND
GND
GND
GND
Tc = 25°C IC C H
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
9
tPHL
3003
47
IN
2.7 V
OUT
2.7 V
2.7 V
GND
Fig. 3
48
2.7 V
IN
OUT
2.7 V
"
“
Tc = 25°C
"
49
"
2.7 V
IN
"
OUT
“
"
50
"
"
2.7 V
IN
OUT
“
"
51
"
"
"
2.7 V
“
OUT
"
52
"
"
"
"
“
OUT
"
53
"
"
"
"
“
"
54
"
"
"
"
“
tPLH
"
55
IN
"
OUT
"
"
“
"
56
2.7 V
IN
OUT
"
"
“
"
57
"
2.7 V
IN
"
OUT
“
"
58
"
"
2.7 V
IN
OUT
“
"
59
"
"
"
2.7 V
“
OUT
"
60
"
"
"
"
“
OUT
"
61
"
"
"
"
“
"
62
"
"
"
"
“
10
tPHL
"
63
IN
"
OUT
"
"
"
"
64
2.7 V
IN
OUT
"
"
“
Tc = 125°C
"
65
"
2.7 V
IN
"
OUT
“
"
66
"
"
2.7 V
IN
OUT
“
"
67
"
"
"
2.7 V
“
OUT
"
68
"
"
"
"
“
OUT
"
69
"
"
"
"
“
"
70
"
"
"
"
“
tPLH
"
71
IN
"
OUT
"
"
“
"
72
2.7 V
IN
OUT
"
"
“
"
73
"
2.7 V
IN
"
OUT
“
"
74
"
"
2.7 V
IN
OUT
“
"
75
"
"
"
2.7 V
“
OUT
"
76
"
"
"
"
“
OUT
"
77
"
"
"
"
“
"
78
"
"
"
"
“
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Measured terminal
1A, 1B, 2A, 2B,
3A, 3B, 4A, 4B
Min/max limits for circuit
A
-160/-400
B
-30/-300
C
-150/-380
D
-160/-400
E
-150/-380
F
-100/-340
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
Measured
terminal
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Unit
Max
4.4
1.6
mA
mA
36
“
“
“
“
“
“
“
40
“
“
“
“
“
“
“
55
“
“
“
“
“
“
“
60
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
14
Cases
A,B,C,D
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
MIL-STD883
method
1
Tc = 25°C
VO H
3006
VO L
3007
VI C
3010
15
II H 2
II L
3009
IO S
3011
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
3
4
6
8
9
10
12
13
14
16
18
19
20
1A
0.7 V
5.5 V
"
"
“
“
2.0 V
GND
“
“
"
"
-18 mA
1Y
-400 µA
2A
5.5 V
0.7 V
5.5 V
"
"
"
GND
2.0 V
GND
"
"
"
2Y
3A
5.5 V
5.5 V
0.7 V
5.5 V
“
"
GND
GND
2.0 V
GND
"
"
3Y
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
4Y
4A
5.5 V
"
"
0.7 V
5.5 V
5.5 V
GND
"
"
2.0 V
GND
GND
5Y
5A
5.5 V
"
"
"
0.7 V
5.5 V
GND
"
"
"
2.0 V
GND
6Y
6A
5.5 V
"
"
“
“
0.7 V
GND
"
"
"
"
2.0 V
VCC
4.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
4 mA
-400 µA
4 mA
-400 µA
4 mA
-18 mA
-18 mA
2.7 V
GND
“
“
“
“
5.5 V
GND
"
"
“
“
0.4 V
5.5 V
“
“
"
"
GND
See footnotes at end of device type 03.
GND
2.7 V
GND
"
"
"
"
5.5 V
GND
"
"
"
5.5 V
0.4 V
5.5 V
"
"
"
GND
GND
2.7 V
GND
"
“
“
“
5.5 V
GND
“
"
5.5 V
5.5 V
0.4 V
5.5 V
"
“
“
GND
GND
GND
GND
GND
-400 µA
4 mA
-400 µA
4 mA
-400 µA
4 mA
-18 mA
-18 mA
GND
“
“
2.7 V
GND
"
“
“
“
5.5 V
GND
GND
5.5 V
"
"
0.4 V
5.5 V
5.5 V
GND
-18 mA
GND
“
“
“
“
2.7 V
GND
"
"
“
“
5.5 V
"
“
“
"
“
0.4 V
GND
"
"
"
2.7 V
GND
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
0.4 V
5.5 V
GND
GND
GND
GND
GND
Measured
terminal
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1Y
2Y
3Y
4Y
5Y
6Y
Limits
Min
2.5
"
"
"
"
"
2/
"
"
"
"
"
3/
“
“
“
“
“
Unit
Max
0.4
“
“
“
"
“
-1.5
“
“
“
“
“
20
“
“
“
“
“
100
“
"
“
“
“
2/
“
“
“
"
"
3/
“
“
“
“
“
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
MIL-M-38510/300E
II H 1
Cases
A,B,C,D
Case 1/
X and 2
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
TABLE III. Group A inspection for device type 03 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
MIL-STDSymbol
883
method
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Case 1/
X and 2
Test no.
43
44
2
3
4
6
8
9
10
12
13
14
16
18
19
20
4A
GND
5.5 V
5Y
5A
GND
5.5 V
6Y
6A
GND
5.5 V
VCC
5.5 V
“
VC C
VC C
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
5.0 V
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A
1Y
2A
2Y
3A
3Y
GND
4Y
1
IC C H
3005
GND
GND
GND
GND
3005
5,5 V
5.5 V
5.5 V
“
Tc = 25°C IC C L
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
9
tPHL
3003
45
IN
OUT
2.7 V
2.7 V
GND
(Fig. 3)
46
2.7 V
IN
OUT
2.7 V
“
Tc = 25°C
47
"
2.7 V
IN
OUT
“
48
"
"
2.7 V
“
OUT
49
"
"
"
“
50
"
"
"
“
tPLH
51
IN
OUT
"
"
“
52
2.7 V
IN
OUT
"
“
53
"
2.7 V
IN
OUT
“
54
"
"
2.7 V
“
OUT
55
"
"
"
“
56
"
"
"
“
10
tPHL
57
IN
OUT
"
"
GND
58
2.7 V
IN
OUT
"
“
Tc = 125°C
59
"
2.7 V
IN
OUT
“
60
"
"
2.7 V
“
OUT
61
"
"
"
“
62
"
"
"
“
tPLH
63
IN
OUT
"
"
“
64
2.7 V
IN
OUT
"
“
65
"
2.7 V
IN
OUT
“
66
"
"
2.7 V
“
OUT
67
"
"
"
“
68
"
"
"
“
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Min/max limits for circuit
Measured terminal
A
1A, 2A, 3A,
4A, 5A, 6A
-150/-380
B
-30/-300
C
-150/-380
D
-160/-400
E
-150/-380
3/ IOS limits for circuit C: -20/-100 mA; for circuits A, B, D, E, and F: -15/-100 mA.
F
-100/-340
2.7 V
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
2.7 V
OUT
OUT
OUT
OUT
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
OUT
OUT
OUT
OUT
Measured
terminal
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
Unit
Max
2.4
6.6
mA
“
17
“
“
“
“
“
15
“
“
“
“
“
24
“
“
“
“
“
20
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
16
Cases
A,B,C,D
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
17
See footnotes at end of device type 04.
9
10
11
12
13
14
13
14
16
18
19
20
4A
GND
"
"
2.0 V
GND
GND
5.5 V
"
"
0.7 V
5.5 V
5.5 V
5Y
5A
GND
"
"
"
2.0 V
GND
5.5 V
"
"
"
0.7 V
5.5 V
6Y
6A
GND
"
"
"
"
2.0 V
5.5 V
"
"
“
“
0.7 V
VCC
4.5 V
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
4 mA
5.5 V
4 mA
5.5 V
-18 mA
-18 mA
GND
“
“
2.7 V
GND
"
“
“
“
5.5 V
GND
GND
5.5 V
"
"
0.4 V
5.5 V
"
"
GND
GND
"
"
"
2.7 V
GND
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
0.4 V
5.5 V
"
GND
-18 mA
GND
“
“
“
“
2.7 V
GND
"
"
“
“
5.5 V
5.5 V
“
“
"
“
0.4 V
5.5 V
GND
Measured
terminal
Limits
Min
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
VC C
VC C
2/
Max
0.4
“
“
“
"
“
100
"
"
"
"
"
-1.5
“
“
“
“
“
20
“
“
“
“
“
100
“
"
“
“
“
2/
“
“
“
6.6
2.4
Unit
“
“
“
“
“
“
µA
“
“
“
“
“
V
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
mA
MIL-M-38510/300E
Cases
1
2
3
4
5
6
7
8
A,B,C,D
Subgroup Symbol
Case 1/
2
3
4
6
8
9
10
12
X and 2
Test no.
1A
1Y
2A
2Y
3A
3Y
GND
4Y
1
VO L
3007
1
2.0 V
4 mA
GND
GND
GND
"
2
GND
2.0 V
4 mA
GND
“
Tc = 25°C
"
3
“
GND
2.0 V
4 mA
“
"
4
“
"
GND
“
4 mA
"
5
"
"
"
“
"
6
"
"
"
“
ICEX
7
0.7 V
5.5 V
5.5 V
5.5 V
"
8
5.5 V
0.7 V
5.5 V
5.5 V
“
9
"
5.5 V
0.7 V
5.5 V
“
10
"
"
5.5 V
“
5.5 V
11
“
"
“
“
12
“
"
"
“
VI C
13
-18 mA
“
14
-18 mA
“
15
-18 mA
“
16
“
17
“
18
“
II H 1
3010
19
2.7 V
GND
GND
“
"
20
GND
2.7 V
GND
“
"
21
“
GND
2.7 V
“
"
22
“
"
GND
“
"
23
“
"
"
“
"
24
“
"
“
“
II H 2
"
25
5.5 V
"
“
“
"
26
GND
5.5 V
“
“
"
27
"
GND
5.5 V
“
"
28
"
"
GND
“
"
29
“
"
“
“
"
30
“
"
"
“
II L
3009
31
0.4 V
5.5 V
5.5 V
“
"
32
5.5 V
0.4 V
5.5 V
“
"
33
“
5.5 V
0.4 V
“
"
34
“
"
5.5 V
“
"
35
"
"
"
“
"
36
"
"
“
“
IC C L
3005
37
"
"
"
“
IC C H
3005
38
GND
GND
GND
“
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
MIL-STD883
method
TABLE III. Group A inspection for device type 04 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
MIL-STDSymbol
883
method
Cases
A,B,C,D
1
2
3
4
5
18
7
8
9
10
11
12
13
14
9
10
12
13
14
16
18
19
20
3Y
GND
GND
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
4Y
4A
2.7 V
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
2.7 V
5Y
5A
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
6Y
6A
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
IN
VCC
5.0 V
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Min/max limits for circuit
Measured terminal
A
1A, 2A, 3A,
4A, 5A, 6A
-150/-380
B
-30/-300
C
-150/-380
D
-160/-400
E
-150/-380
F
-120/-360
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
Max
36
“
“
“
“
“
40
“
“
“
“
“
55
“
“
“
“
“
60
“
“
“
“
“
Unit
ns
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
Case 1/
2
3
4
6
8
X and 2
Test no.
1A
1Y
2A
2Y
3A
9
tPHL
3003
39
IN
OUT
2.7 V
2.7 V
(Fig. 3)
40
2.7 V
IN
OUT
2.7 V
Tc = 25°C
41
"
2.7 V
IN
42
"
"
"
43
"
"
"
44
"
"
"
tPLH
45
IN
OUT
"
"
46
2.7 V
IN
OUT
"
47
"
2.7 V
IN
48
"
"
2.7 V
49
"
"
"
50
"
"
"
10
tPHL
51
IN
OUT
"
"
52
2.7 V
IN
OUT
"
Tc = 125°C
53
"
2.7 V
IN
54
"
"
2.7 V
55
"
"
"
56
"
"
"
tPLH
57
IN
OUT
"
"
58
2.7 V
IN
OUT
"
59
"
2.7 V
IN
60
"
"
2.7 V
61
"
"
"
62
"
"
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
6
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
1
Tc = 25°C
VO H
VO L
MIL-STD883
method
3006
"
"
"
"
"
"
"
"
3007
"
"
VI C
19
II H 2
II L
3010
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3009
"
"
"
"
"
"
"
"
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
3
4
6
8
9
10
12
13
14
16
18
19
20
1A
0.7 V
5.5 V
"
"
"
"
"
"
"
2.0 V
GND
GND
-18 mA
1B
5.5 V
0.7 V
5.5 V
"
"
"
"
"
"
2.0 V
GND
GND
2A
5.5 V
"
"
0.7 V
5.5 V
"
"
"
"
GND
2.0 V
GND
2B
5.5 V
"
"
"
0.7 V
5.5 V
"
"
"
GND
2.0 V
GND
2C
5.5 V
"
"
"
"
0.7 V
5.5 V
"
"
GND
2.0 V
GND
2Y
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3Y
3A
5.5 V
"
"
"
"
"
0.7 V
5.5 V
"
GND
GND
2.0 V
3B
5.5 V
"
"
"
"
"
"
0.7 V
5.5 V
GND
GND
2.0 V
3C
5.5 V
"
"
"
"
"
"
"
0.7 V
GND
GND
2.0 V
1Y
-400µA
"
"
1C
5.5 V
5.5 V
0.7 V
5.5 V
"
"
"
"
"
2.0 V
GND
GND
VCC
4.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-18 mA
-18 mA
-18 mA
-18 mA
2.7 V
GND
“
“
“
“
“
"
“
5.5 V
GND
“
“
“
“
“
"
“
0.4 V
5.5 V
“
“
“
“
“
“
“
See footnotes at end of device type 05
GND
2.7 V
GND
“
“
“
“
"
“
"
5.5 V
GND
“
“
“
“
"
“
5.5 V
0.4 V
5.5 V
“
“
“
“
“
“
GND
"
"
2.7 V
GND
"
"
"
"
"
"
"
5.5 V
GND
"
"
"
"
5.5 V
"
"
0.4 V
5.5 V
"
"
"
"
GND
"
"
"
2.7 V
GND
“
"
“
"
"
"
"
5.5 V
GND
“
"
“
5.5 V
"
"
"
0.4 V
5.5 V
“
“
“
GND
"
"
"
"
2.7 V
GND
"
“
"
"
"
"
"
5.5 V
GND
"
“
5.5 V
“
“
"
"
0.4 V
5.5 V
“
“
-400µA
"
"
4 mA
-400µA
"
"
4 mA
4 mA
-18 mA
-18 mA
-18 mA
GND
“
“
“
"
"
2.7 V
GND
“
"
“
“
“
"
"
5.5 V
GND
“
5.5 V
“
“
“
"
0.4 V
5.5 V
"
GND
“
“
“
“
"
"
2.7 V
GND
"
“
“
“
“
"
"
5.5 V
GND
5.5 V
“
“
“
“
"
"
0.4 V
5.5 V
GND
2.7 V
GND
5.5 V
"
"
"
"
"
"
"
"
0.4 V
-18 mA
GND
GND
2.7 V
GND
“
“
“
"
"
"
"
5.5 V
GND
“
“
“
"
"
5.5 V
“
0.4 V
5.5 V
"
“
“
“
"
Measured
terminal
1Y
1Y
1Y
2Y
2Y
2Y
3Y
3Y
3Y
1Y
2Y
3Y
1A
1B
2A
2B
2C
3A
3B
3C
1C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
Limits
Min
2.5
“
“
“
"
"
"
"
"
2/
“
“
“
“
“
“
“
“
Unit
Max
0.4
“
“
-1.5
“
“
“
“
“
“
“
“
20
“
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
“
2/
“
“
“
“
“
“
“
“
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
II H 1
Cases
A,B,C,D
Case 1/
X and 2
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
MIL-STDSymbol
883
method
Cases
A,B,C,D
1
2
3
4
5
6
7
8
10
11
12
13
14
13
14
16
18
19
20
3A
3B
3C
1Y
GND
1C
GND
GND
5.5 V
VCC
5.5 V
“
“
“
“
1Y
2Y
3Y
VC C
VC C
2.7 V
2.7 V
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
5.0 V
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
GND
GND
5.5 V
GND
GND
5.5 V
GND
GND
5.5 V
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
2.7 V
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
Measured
terminal
Limits
Unit
Min
3/
“
“
Max
3/
“
“
1.2
3.3
mA
“
“
“
“
2
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
17
“
“
“
“
“
“
“
“
15
“
“
“
“
“
“
“
“
24
“
“
“
“
“
“
“
“
20
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
MIL-M-38510/300E
20
Case 1/
2
3
4
6
8
9
10
12
X and 2
Test no.
1A
1B
2A
2B
2C
2Y
GND
3Y
1
IO S
3011
49
GND
GND
GND
50
GND
GND
GND
GND
“
Tc = 25°C
51
“
GND
IC C H
3005
52
GND
GND
GND
GND
GND
“
IC C L
3005
53
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
“
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
9
tPHL
3003
54
IN
2.7 V
2.7 V
2.7 V
2.7 V
GND
Fig. 3
55
2.7 V
IN
"
"
"
“
Tc = 25°C
"
56
"
2.7 V
"
"
"
“
"
57
"
"
IN
"
"
OUT
“
"
58
"
"
2.7 V
IN
"
"
“
"
59
"
"
"
2.7 V
IN
"
“
"
60
"
"
"
"
2.7 V
“
OUT
"
61
"
"
"
"
"
“
"
"
62
"
"
"
"
"
“
"
tPLH
"
63
IN
"
"
"
"
"
"
64
2.7 V
IN
"
"
"
“
"
65
"
2.7 V
"
"
"
“
"
66
"
"
IN
"
"
OUT
“
"
67
"
"
2.7 V
IN
"
"
“
"
68
"
"
"
2.7 V
IN
"
“
"
69
"
"
"
"
2.7 V
“
OUT
"
70
"
"
"
"
"
“
"
"
71
"
"
"
"
"
“
"
10
tPHL
"
72
IN
"
"
"
"
"
"
73
2.7 V
IN
"
"
"
“
Tc = 125°C
"
74
"
2.7 V
"
"
"
“
"
75
"
"
IN
"
"
OUT
“
"
76
"
"
2.7 V
IN
"
"
“
"
77
"
"
"
2.7 V
IN
"
“
"
78
"
"
"
"
2.7 V
“
OUT
"
79
"
"
"
"
"
“
"
"
80
"
"
"
"
"
“
"
tPLH
"
81
IN
"
"
"
"
"
"
82
2.7 V
IN
"
"
"
“
"
83
"
2.7 V
"
"
"
“
"
84
"
"
IN
"
"
OUT
“
"
85
"
"
2.7 V
IN
"
"
“
"
86
"
"
"
2.7 V
IN
"
“
"
87
"
"
"
"
2.7 V
“
OUT
"
88
"
"
"
"
"
“
"
"
89
"
"
"
"
"
“
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
9
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Measured terminal
Min/max limits for circuit
A
1A, 1B, 1C,
2A, 2B, 2C
1C, 2C, 3C
-120/-360
B
-30/-300
C
-150/-380
D
-150/-380
E
-160/-400
F
-100/-340
3/ IOS limits for circuit C are: -20/-100 mA; for circuit B are: -30/-300 mA: for circuits A, D, E, and F: -15/-100 mA.
MIL-M-38510/300E
21
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
22
See footnotes at end of device type 06
9
10
11
12
13
14
13
14
16
18
19
20
3A
GND
GND
2.0 V
5.5 V
"
"
"
"
"
0.7 V
5.5 V
"
3B
GND
GND
2.0 V
5.5 V
"
"
"
"
"
"
0.7 V
5.5 V
3C
GND
GND
2.0 V
5.5 V
"
"
"
"
"
"
"
0.7 V
1Y
4 mA
1C
2.0 V
GND
GND
5.5 V
5.5 V
0.7 V
5.5 V
"
"
"
"
"
VCC
4.5 V
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.5 V
"
"
-18 mA
-18 mA
-18 mA
GND
“
“
“
"
"
2.7 V
GND
“
"
“
“
“
"
"
5.5 V
GND
“
5.5 V
“
“
“
"
"
0.4 V
5.5 V
5.5 V
GND
“
“
“
“
"
"
2.7 V
GND
"
“
“
“
“
"
"
5.5 V
GND
5.5 V
“
“
“
“
"
"
0.4 V
5.5 V
-18 mA
GND
"
"
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
0.4 V
GND
GND
2.7 V
GND
“
“
“
"
"
"
"
5.5 V
GND
“
“
“
"
"
5.5 V
5.5 V
0.4 V
5.5 V
"
“
“
“
"
Measured
terminal
Limits
Min
1Y
2Y
3Y
1Y
1Y
1Y
2Y
2Y
2Y
3Y
3Y
3Y
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
2/
“
“
“
“
“
“
“
“
Max
0.4
“
“
100
"
"
"
"
"
"
"
"
-1.5
“
“
“
“
“
“
“
“
20
“
“
“
“
“
“
“
“
100
“
“
“
“
“
“
“
“
2/
“
“
“
“
“
“
“
“
Unit
V dc
“
“
µA
“
“
“
“
“
“
“
“
V dc
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
Cases
1
2
3
4
5
6
7
8
A,B,C,D
Subgroup Symbol
Case 1/
2
3
4
6
8
9
10
12
X and 2
Test no.
1A
1B
2A
2B
2C
2Y
GND
3Y
1
VO L
3007
1
2.0 V
2.0 V
GND
GND
GND
GND
"
2
GND
GND
2.0 V
2.0 V
2.0 V
4 mA
“
Tc = 25°C
"
3
GND
GND
GND
GND
GND
“
4 mA
ICEX
4
0.7 V
5.5 V
5.5 V
5.5 V
5.5 V
"
5
5.5 V
0.7 V
"
"
"
“
6
"
5.5 V
"
"
"
“
7
"
"
0.7 V
"
"
5.5 V
“
8
"
"
5.5 V
0.7 V
"
"
“
9
"
"
"
5.5 V
0.7 V
"
“
10
"
"
"
"
5.5 V
“
5.5 V
11
"
"
"
"
"
“
"
12
"
"
"
"
"
“
"
VI C
13
-18 mA
“
14
-18 mA
“
15
“
16
-18 mA
“
17
-18 mA
“
18
-18 mA
“
19
“
20
“
21
“
II H 1
3010
22
2.7 V
GND
GND
GND
GND
“
"
23
GND
2.7 V
"
"
"
“
"
24
“
GND
"
"
"
“
"
25
“
“
2.7 V
"
"
“
"
26
“
“
GND
2.7 V
"
“
"
27
“
“
"
GND
2.7 V
“
"
28
“
“
"
“
GND
“
"
29
"
"
"
"
"
“
"
30
“
“
"
“
“
“
II H 2
"
31
5.5 V
"
"
"
"
“
"
32
GND
5.5 V
"
"
"
“
"
33
“
GND
"
"
"
“
"
34
“
“
5.5 V
"
"
“
"
35
“
“
GND
5.5 V
"
“
"
36
“
“
"
GND
5.5 V
“
"
37
“
“
"
“
GND
“
"
38
"
"
"
"
"
“
"
39
“
“
"
“
“
“
II L
3009
40
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
“
"
41
5.5 V
0.4 V
"
"
“
“
"
42
“
5.5 V
"
"
“
“
"
43
“
“
0.4 V
"
"
“
"
44
“
“
5.5 V
0.4 V
"
“
"
45
“
“
"
5.5 V
0.4 V
“
"
46
“
“
"
“
5.5 V
“
"
47
“
“
"
“
“
“
"
48
“
“
"
“
“
“
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
MIL-STD883
method
TABLE III. Group A inspection for device type 06 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
MIL-STDSymbol
883
method
Cases
A,B,C,D
1
2
3
4
5
23
7
8
9
10
11
12
13
14
9
10
12
13
14
16
18
19
20
2Y
GND
GND
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
3Y
3A
GND
5.5 V
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
2.7 V
3B
GND
5.5 V
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
3C
GND
5.5 V
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
1Y
1C
GND
5.5 V
2.7 V
2.7 V
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
VCC
5.5 V
“
5.0 V
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Min/max limits for circuit
Measured terminal
A
1A, 1B, 1C, 2A, 2B, 2C, 3A, 3B, 3C
-160/-400
B
-30/-300
C
-150/-380
D
-160/-400
E
-150/-380
F
-150/-380
OUT
"
"
OUT
"
"
OUT
"
"
OUT
"
"
Measured
terminal
Limits
Min
VC C
VC C
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
1A to 1Y
1B to 1Y
1C to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
3A to 3Y
3B to 3Y
3C to 3Y
2
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
2
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
Max
1.4
3.3
36
“
“
“
“
“
“
“
“
40
“
“
“
“
“
“
“
“
55
“
“
“
“
“
“
“
“
60
“
“
“
“
“
“
“
“
Unit
mA
mA
ns
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
MIL-M-38510/300E
Case 1/
2
3
4
6
8
X and 2
Test no.
1A
1B
2A
2B
2C
1
IC C H
3005
49
GND
GND
GND
GND
GND
3005
50
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
Tc = 25°C IC C L
9
tPHL
3003
51
IN
2.7 V
2.7 V
2.7 V
2.7 V
Fig. 3
52
2.7 V
IN
"
"
"
Tc = 25°C
"
53
"
2.7 V
"
"
"
"
54
"
"
IN
"
"
"
55
"
"
2.7 V
IN
"
"
56
"
"
"
2.7 V
IN
"
57
"
"
"
"
2.7 V
"
58
"
"
"
"
"
"
59
"
"
"
"
"
tPLH
"
60
IN
"
"
"
"
"
61
2.7 V
IN
"
"
"
"
62
"
2.7 V
"
"
"
"
63
"
"
IN
"
"
"
64
"
"
2.7 V
IN
"
"
65
"
"
"
2.7 V
IN
"
66
"
"
"
"
2.7 V
"
67
"
"
"
"
"
"
68
"
"
"
"
"
10
tPHL
3003
69
IN
"
"
"
"
Fig. 3
70
2.7 V
IN
"
"
"
Tc = 125°C
"
71
"
2.7 V
"
"
"
"
72
"
"
IN
"
"
"
73
"
"
2.7 V
IN
"
"
74
"
"
"
2.7 V
IN
"
75
"
"
"
"
2.7 V
"
76
"
"
"
"
"
"
77
"
"
"
"
"
tPLH
"
78
IN
"
"
"
"
"
79
2.7 V
IN
"
"
"
"
80
"
2.7 V
"
"
"
"
81
"
"
IN
"
"
"
82
"
"
2.7 V
IN
"
"
83
"
"
"
2.7 V
IN
"
84
"
"
"
"
2.7 V
"
85
"
"
"
"
"
"
86
"
"
"
"
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C.
6
TABLE III. Group A inspection for device type 07.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
24
See footnotes at end of device type 07.
10
11
12
13
14
14
16
18
19
20
2B
5.5 V
"
"
"
"
0.7 V
5.5 V
5.5 V
GND
2.0 V
NC
2C
5.5 V
"
"
"
"
"
0.7 V
5.5 V
GND
2.0 V
2D
5.5 V
"
"
"
"
"
"
0.7 V
GND
2.0 V
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
“
-18 mA
-18 mA
GND
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
GND
5.5 V
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
-18 mA
GND
"
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
0.4 V
GND
GND
5.5 V
GND
GND
5.5 V
GND
GND
5.5 V
Measured
terminal
1Y
1Y
1Y
1Y
2Y
2Y
2Y
2Y
1Y
2Y
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1Y
2Y
VC C
VC C
Limits
Min
2.5 V
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
3/
3/
Unit
Max
0.4
0.4
-1.5
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
3/
3/
0.8
2.2
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
"
“
“
MIL-M-38510/300E
Cases
1
2
3
4
5
6
7
8
9
A,B,C,D
Subgroup Symbol
Case 1/
2
3
4
6
8
9
10
12
13
X and 2
Test no.
1A
1B
NC
1C
1D
1Y
GND
2Y
2A
1
VOH
3006
1
0.7 V
5.5 V
5.5 V
5.5 V -400 µA GND
5.5 V
"
2
5.5 V
0.7 V
5.5 V
"
"
“
"
Tc = 25°C
"
3
"
5.5 V
0.7 V
"
"
“
"
"
4
"
"
5.5 V
0.7 V
"
“
"
"
5
"
"
"
5.5 V
“
-400 µA 0.7 V
"
6
"
"
"
"
“
"
5.5 V
"
7
"
"
"
"
“
"
"
"
8
"
"
"
"
“
"
"
VOL
3007
9
2.0 V
2.0 V
2.0 V
2.0 V
4mA
“
GND
3007
10
GND
GND
GND
GND
“
4mA
2.0 V
VIC
11
-18 mA
“
12
-18 mA
“
13
-18 mA
“
14
-18mA
“
15
“
-18 mA
16
“
17
“
18
“
IIH1
3010
19
2.7 V
GND
GND
GND
“
GND
"
20
GND
2.7 V
GND
"
“
"
"
21
"
GND
2.7 V
"
“
"
"
22
"
"
GND
2.7 V
“
"
"
23
"
"
"
GND
“
2.7 V
"
24
"
"
"
"
“
GND
"
25
"
"
"
"
“
"
"
26
"
"
"
"
“
"
IIH2
"
27
5.5 V
"
"
"
“
"
"
28
GND
5.5 V
"
"
“
"
"
29
"
GND
5.5 V
"
“
"
"
30
"
"
GND
5.5 V
“
"
"
31
"
"
"
GND
“
5.5 V
"
32
"
"
"
"
“
GND
"
33
"
"
"
"
“
"
"
34
"
"
"
"
“
"
IIL
3009
35
0.4 V
5.5 V
5.5 V
5.5 V
“
5.5 V
"
36
5.5 V
0.4 V
5.5 V
"
“
"
"
37
"
5.5 V
0.4 V
"
“
"
"
38
"
"
5.5 V
0.4 V
“
"
"
39
"
"
"
5.5 V
“
0.4 V
"
40
"
"
"
"
“
5.5 V
"
41
"
"
"
"
“
"
"
42
"
"
"
"
“
"
IOS
3011
43
GND
GND
GND
GND
GND
“
3011
44
“
GND
GND
IC C H
3005
49
GND
GND
GND
GND
“
GND
IC C L
3005
50
5.5 V
5.5 V
5.5 V
5.5 V
“
5.5 V
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
MIL-STD883
method
TABLE III. Group A inspection for device type 07 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
MIL-STD883
method
Cases
A,B,C,D
1
2
3
4
6
7
8
9
10
11
12
13
14
8
9
10
12
13
14
16
18
19
20
1Y
OUT
"
"
"
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
2Y
2A
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
2B
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
NC
2C
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2D
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
VCC
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1D
2.7 V
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
-55° C.
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Min/max limits for circuit
Measured terminal
A
B
C
D
1A, 1B, 1C, 1D,
-120/-360
-30/-300
-160/-400
-120/-360
2A, 2B, 2C, 2D
3/ IOS limits for circuit C: -20/-100 mA; for circuits A, B, D, E, and F: -15/-100 mA.
E
-150/-380
F
-100/-340
Measured
terminal
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Max
17
“
“
“
“
“
“
“
15
"
“
“
“
“
“
“
24
“
“
“
“
“
“
“
20
"
“
“
“
“
“
“
Unit
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
25
Case 1/
2
3
4
6
X and 2
Test no.
1A
1B
NC
1C
9
tPHL
3003
47
IN
2.7 V
2.7 V
Fig. 3
48
2.7 V
IN
2.7 V
Tc = 25°C
"
49
"
2.7 V
IN
"
50
"
"
2.7 V
"
51
"
"
"
"
52
"
"
"
"
53
"
"
"
"
54
"
"
"
tPLH
"
55
IN
"
"
"
56
2.7 V
IN
"
"
57
"
2.7 V
IN
"
58
"
"
2.7 V
"
59
"
"
"
"
60
"
"
"
"
61
"
"
"
"
62
"
"
"
10
tPHL
3003
63
IN
"
"
Fig. 3
64
2.7 V
IN
"
Tc = 125°C
"
65
"
2.7 V
IN
"
66
"
"
2.7 V
"
67
"
"
"
"
68
"
"
"
"
69
"
"
"
"
70
"
"
"
tPLH
"
71
IN
"
"
"
72
2.7 V
IN
"
"
73
"
2.7 V
IN
"
74
"
"
2.7 V
"
75
"
"
"
"
76
"
"
"
"
77
"
"
"
"
78
"
"
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC =
5
TABLE III. Group A inspection for device type 08.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
26
See footnotes at end of device type 08.
9
10
11
12
13
14
13
14
16
18
19
20
2A
GND
2.0 V
5.5 V
"
"
"
0.7 V
5.5 V
"
"
2B
GND
2.0 V
5.5 V
"
"
"
"
0.7 V
5.5 V
"
NC
2C
GND
2.0 V
5.5 V
"
"
"
"
"
0.7 V
5.5 V
2D
GND
2.0 V
5.5 V
"
"
"
"
"
"
0.7 V
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
“
-18 mA
-18 mA
-18 mA
GND
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
0.4 V
5.5 V
"
"
"
GND
GND
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
GND
5.5 V
"
"
"
"
0.4 V
5.5 V
5.5 V
"
GND
GND
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
-18 mA
GND
"
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
0.4 V
5.5 V
GND
Measured
terminal
Limits
Min
1Y
2Y
1Y
1Y
1Y
1Y
2Y
2Y
2Y
2Y
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
VC C
VC C
2/
"
"
"
"
"
"
"
Max
0.4
0.4
100
"
"
"
"
"
"
"
-1.5
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
2.2
0.8
Unit
V
V
µA
"
"
"
"
"
"
"
V
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
mA
MIL-M-38510/300E
Cases
1
2
3
4
5
6
7
8
A,B,C,D
Subgroup Symbol
Case 1/
2
3
4
6
8
9
10
12
X and 2
Test no.
1A
1B
NC
1C
1D
1Y
GND
2Y
1
VOL
3007
1
2.0 V
2.0 V
2.0 V
2.0 V
4mA
GND
3007
2
GND
GND
GND
GND
“
4mA
Tc = 25°C
ICEX
3
0.7 V
5.5 V
5.5 V
5.5 V
5.5 V
"
4
5.5 V
0.7 V
5.5 V
"
"
“
5
"
5.5 V
0.7 V
"
"
“
6
"
"
5.5 V
0.7 V
"
“
7
"
"
"
5.5 V
“
5.5 V
8
"
"
"
"
“
"
9
"
"
"
"
“
"
10
"
"
"
"
“
"
VIC
11
-18 mA
“
12
-18 mA
“
13
-18 mA
“
14
-18mA
“
15
“
16
“
17
“
18
“
IIH1
3010
19
2.7 V
GND
GND
GND
“
"
20
GND
2.7 V
GND
"
“
"
21
"
GND
2.7 V
"
“
"
22
"
"
GND
2.7 V
“
"
23
"
"
"
GND
“
"
24
"
"
"
"
“
"
25
"
"
"
"
“
"
26
"
"
"
"
“
IIH2
"
27
5.5 V
"
"
"
“
"
28
GND
5.5 V
"
"
“
"
29
"
GND
5.5 V
"
“
"
30
"
"
GND
5.5 V
“
"
31
"
"
"
GND
“
"
32
"
"
"
"
“
"
33
"
"
"
"
“
"
34
"
"
"
"
“
IIL
3009
35
0.4 V
5.5 V
5.5 V
5.5 V
“
"
36
5.5 V
0.4 V
5.5 V
"
“
"
37
"
5.5 V
0.4 V
"
“
"
38
"
"
5.5 V
0.4 V
“
"
39
"
"
"
5.5 V
“
"
40
"
"
"
"
“
"
41
"
"
"
"
“
"
42
"
"
"
"
“
IC C L
3005
43
"
"
"
"
“
IC C H
3005
44
GND
GND
GND
GND
“
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
MIL-STD883
method
TABLE III. Group A inspection for device type 08 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
MIL-STD883
method
Cases
A,B,C,D
1
2
3
4
6
7
8
9
10
11
12
13
14
8
9
10
12
13
14
16
18
19
20
1Y
OUT
"
"
"
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
2Y
2A
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
2B
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2.7 V
NC
2C
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2D
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
VCC
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1D
2.7 V
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
-55° C.
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
OUT
"
"
"
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Min/max limits for circuit
Measured terminal
A
1A, 1B, 1C, 1D,
2A, 2B, 2C, 2D
-160/-400
B
-30/-300
C
-160/-400
D
-200/-440
E
-150/-380
F
-120/-360
Measured
terminal
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
1A to 1Y
1B to 1Y
1C to 1Y
1D to 1Y
2A to 2Y
2B to 2Y
2C to 2Y
2D to 2Y
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Max
36
“
“
“
“
“
“
“
40
"
“
“
“
“
“
“
55
“
“
“
“
“
“
“
60
"
“
“
“
“
“
“
Unit
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
27
Case 1/
2
3
4
6
X and 2
Test no.
1A
1B
NC
1C
9
tPHL
3003
45
IN
2.7 V
2.7 V
Fig. 3
46
2.7 V
IN
2.7 V
Tc = 25°C
"
47
"
2.7 V
IN
"
48
"
"
2.7 V
"
49
"
"
"
"
50
"
"
"
"
51
"
"
"
"
52
"
"
"
tPLH
"
53
IN
"
"
"
54
2.7 V
IN
"
"
55
"
2.7 V
IN
"
56
"
"
2.7 V
"
57
"
"
"
"
58
"
"
"
"
59
"
"
"
"
60
"
"
"
10
tPHL
"
61
IN
"
"
"
62
2.7 V
IN
"
Tc = 125°C
"
63
"
2.7 V
IN
"
64
"
"
2.7 V
"
65
"
"
"
"
66
"
"
"
"
67
"
"
"
"
68
"
"
"
tPLH
"
69
IN
"
"
"
70
2.7 V
IN
"
"
71
"
2.7 V
IN
"
72
"
"
2.7 V
"
73
"
"
"
"
74
"
"
"
"
75
"
"
"
"
76
"
"
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC =
5
TABLE III. Group A inspection for device type 09.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
28
See footnotes at end of device type 09.
9
10
11
12
13
14
13
14
16
18
19
20
NC
NC
G
5.5 V
"
"
"
"
"
0.7 V
5.5 V
2.0 V
H
5.5 V
"
"
"
"
"
"
0.7 V
2.0 V
NC
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
“
“
-18 mA
GND
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
GND
GND
5.5 V
-18 mA
GND
"
"
"
"
"
"
2.7 V
GND
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
0.4 V
GND
GND
5.5 V
Measured
terminal
Y
"
"
"
"
"
"
"
"
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
Y
VC C
VC C
Limits
Min
2.5 V
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
3/
Unit
Max
0.4
-1.5
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
2/
"
"
"
"
"
"
"
3/
0.5
1.1
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
“
“
MIL-M-38510/300E
Cases
1
2
3
4
5
6
7
8
A,B,C,D
Subgroup Symbol
Case 1/
2
3
4
6
8
9
10
12
X and 2
Test no.
A
B
C
D
E
F
GND
Y
1
VOH
3006
1
0.7 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
GND -400 µA
"
2
5.5 V
0.7 V
5.5 V
"
"
"
“
"
Tc = 25°C
"
3
"
5.5 V
0.7 V
"
"
"
“
"
"
4
"
"
5.5 V
0.7 V
"
"
“
"
"
5
"
"
5.5 V
0.7 V
"
“
"
"
6
"
"
"
5.5 V
0.7 V
“
"
"
7
"
"
"
"
5.5 V
“
"
"
8
"
"
"
"
5.5 V
“
"
VOL
3007
9
2.0 V
2.0 V
2.0 V
2.0 V
2.0 V
2.0 V
“
4 mA
VIC
10
-18 mA
“
11
-18 mA
“
12
-18 mA
“
13
-18 mA
“
14
-18 mA
“
15
-18 mA
“
16
“
17
“
IIH1
3010
18
2.7 V
GND
GND
GND
GND
GND
“
"
19
GND
2.7 V
GND
"
"
"
“
"
20
"
GND
2.7 V
"
"
"
“
"
21
"
"
GND
2.7 V
"
"
“
"
22
"
"
"
GND
2.7 V
"
“
"
23
"
"
"
"
GND
2.7 V
“
"
24
"
"
"
"
"
GND
“
"
25
"
"
"
"
"
"
“
IIH2
"
26
5.5 V
"
"
"
"
"
“
"
27
GND
5.5 V
"
"
"
"
“
"
28
"
GND
5.5 V
"
"
"
“
"
29
"
"
GND
5.5 V
"
"
“
"
30
"
"
GND
5.5 V
"
“
"
31
"
"
"
GND
5.5 V
“
"
32
"
"
"
"
GND
“
"
33
"
"
"
"
GND
“
IIL
3009
34
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
“
"
35
5.5 V
0.4 V
5.5 V
"
"
"
“
"
36
"
5.5 V
0.4 V
"
"
"
“
"
37
"
"
5.5 V
0.4 V
"
"
“
"
38
"
"
"
5.5 V
0.4 V
"
“
"
39
"
"
"
"
5.5 V
0.4 V
“
"
40
"
"
"
"
"
5.5 V
“
"
41
"
"
"
"
"
5.5 V
“
IOS
3011
42
GND
GND
GND
GND
GND
GND
“
GND
IC C H
3006
43
GND
GND
GND
GND
GND
GND
“
IC C L
3005
44
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
“
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and V I C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55° C, and V I C tests are omitted.
MIL-STD883
method
TABLE III. Group A inspection for device type 09 – Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V or low ≤ 0.7 V or open).
Subgroup
Symbol
MIL-STD883
method
Cases
A,B,C,D
1
2
3
4
6
7
8
9
10
11
12
13
14
8
9
10
12
13
14
16
18
19
20
F
2.7 V
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
2.7 V
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Y
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
NC
NC
G
2.7 V
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
H
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
NC
VCC
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E
2.7 V
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
"
"
"
"
IN
2.7 V
"
"
-55° C.
1/ For case X and 2, pins not referenced are NC.
2/ IIL limits in µA are as follows:
Measured terminal
Min/max limits for circuit
A
B
C
D
E
A, B, C, D, E, F, G, H -0/-360
-30/-300
-160/-400
-160/-400
-150/380
3/ IOS limits for circuit C: -20/-100 mA; for circuits A, B, D, E, and F: -15/-100 mA.
F
-160/-400
Measured
terminal
A to Y
B to Y
C to Y
D to Y
E to Y
F to Y
G to Y
H to Y
A to Y
B to Y
C to Y
D to Y
E to Y
F to Y
G to Y
H to Y
A to Y
B to Y
C to Y
D to Y
E to Y
F to Y
G to Y
H to Y
A to Y
B to Y
C to Y
D to Y
E to Y
F to Y
G to Y
H to Y
Limits
Min
2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Max
28
“
“
“
“
“
“
“
20
"
“
“
“
“
“
“
38
“
“
“
“
“
“
“
32
"
“
“
“
“
“
“
Unit
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/300E
29
Case 1/
2
3
4
6
X and 2
Test no.
A
B
C
D
9
tPHL
3003
45
IN
2.7 V
2.7 V
2.7 V
Fig. 3
46
2.7 V
IN
2.7 V
"
Tc = 25°C
"
47
"
2.7 V
IN
"
"
48
"
"
2.7 V
IN
"
49
"
"
"
2.7 V
"
50
"
"
"
"
"
51
"
"
"
"
"
52
"
"
"
"
tPLH
"
53
IN
"
"
"
"
54
2.7 V
IN
"
"
"
55
"
2.7 V
IN
"
"
56
"
"
2.7 V
IN
"
57
"
"
"
2.7 V
"
58
"
"
"
"
"
59
"
"
"
"
"
60
"
"
"
"
10
tPHL
"
61
IN
"
"
"
"
62
2.7 V
IN
"
"
Tc = 125°C
"
63
"
2.7 V
IN
"
"
64
"
"
2.7 V
IN
"
65
"
"
"
2.7 V
"
66
"
"
"
"
"
67
"
"
"
"
"
68
"
"
"
"
tPLH
"
69
IN
"
"
"
"
70
2.7 V
IN
"
"
"
71
"
2.7 V
IN
"
"
72
"
"
2.7 V
IN
"
73
"
"
"
2.7 V
"
74
"
"
"
"
"
75
"
"
"
"
"
76
"
"
"
"
11
Same tests, terminal conditions and limits as for subgroup 10, except TC =
5
MIL-M-38510/300E
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these
personnel need to contact the responsible packaging activity to ascertain requisite packaging requirements.
Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military
Department of Defense Agency, or within the Military Department's System Command. Packaging data retrieval is
available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM
products, or by contacting the responsible packaging activity.
6. NOTES
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
Complete part number (see 1.2).
c.
Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to contracting activity in addition to
notification to the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883),
corrective action, and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements shall
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
j.
Requirements for "JAN" marking.
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
30
MIL-M-38510/300E
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ...........................................
IIN ................................................
VIC ...............................................
VIN ...............................................
Ground zero voltage potential
Current flowing into an input terminal
Input clamp voltage
Voltage level at an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer length leads and lead forming shall not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation
to case size. The presence of this information shall not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Military device
type
Generic-industry
type
01
02
03
04
05
06
07
08
09
54LS00
54LS03
54LS04
54LS05
54LS10
54LS12
54LS20
54LS22
54LS30
6.8 Manufacturers' designation. Manufacturers' circuits, which form a part of this specification, are designated
with an "X" as shown in table IV herein.
TABLE IV. Substitutability and manufacturers' designation.
Manufacturer
Device
Circuit A
Circuit B
Circuit C
Circuit D
type Texas Instru- Signetics
National
Raytheon
ments Inc. Corporation Semiconductor
Company
Corp
01
02
03
04
05
06
07
08
09
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
Circuit E
Motorola
Inc
X
X
X
X
X
X
X
X
X
Circuit F
Fairchild
Semiconductor
X
X
X
X
X
X
X
X
6.9 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the
previous issue due to the extensiveness of the changes.
31
MIL-M-38510/300E
Custodians:
Army - CR
Navy - EC
Air Force - 11
DLA - CC
Preparing activity:
DLA - CC
(Project 5962-1945)
Review activities:
Army - HD, MI, SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
32
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
INSTRUCTIONS
1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision letter should be given.
2. The submitter of this form must complete blocks 4, 5, 6, and 7, and send to preparing activity.
3. The preparing activity must provide a reply within 30 days from receipt of the form.
NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of requirements on current contracts.
Comments submitted on this form do not constitute or imply authorization to waive any portion of the referenced document(s) or to amend
contractual requirements.
I RECOMMEND A CHANGE:
1. DOCUMENT NUMBER
MIL-M-38510/300E
2. DOCUMENT DATE (YYYYMMDD)
2003-01-07
3. DOCUMENT TITLE
MICROCIRCUITS, DIGITAL, BIPOLAR LOW-POWER SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)
5. REASON FOR RECOMMENDATION
6. SUBMITTER
a. NAME (Last, First Middle Initial)
c. ADDRESS (Include Zip Code)
8. PREPARING ACTIVITY
a. NAME
Defense Supply Center, Columbus
c. ADDRESS (Include Zip Code)
DSCC-VA
P. O. Box 3990
Columbus, Ohio 43216-5000
DD Form 1426, FEB 1999 (EG)
b. ORGANIZATION
d. TELEPHONE (Include Area Code)
(1) Commercial
(2) DSN
(If applicable)
b. TELEPHONE (Include Area Code
(1) Commercial 614-692-0536
7. DATE SUBMITTED
(YYYYMMDD)
(2) DSN 850-0536
IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT:
Defense Standardization Program Office (DLSC-LM)
8725 John J. Kingman Road, Suite 2533
Fort Belvoir, Virginia 22060-6221
Telephone (703)767-6888 DSN 427-6888
PREVIOUS EDITIONS ARE OBSOLETE.
WHS/DIOR, Feb 99
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