Download datasheet for 54LS259B/BEA by Rochester Electronics

Download datasheet for 54LS259B/BEA by Rochester Electronics
INCH-POUND
MIL-M-38510/316E
14 July 2003
_
SUPERSEDING
MIL-M-38510/316D
10 December 1987
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL,
CASCADABLE LATCHES, MONOLITHIC SILICON
Inactive for new design after 18 April 1997.
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL,
latches. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type
and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been
superseded by MIL-PRF-38535, (see 6.3).
1.2 Part number. The part number should be in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types should be as follows:
Circuit
Device type
01
4 - bit cascadable bistable latch
02
03
04
05
Quad cascadable S - R latch
8 - bit cascadable addressable latch
4 - bit cascadable bistable latch
8 - bit cascadable addressable latch
1.2.2 Device class. The device class should be the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines should be as designated in MIL-STD-1835 and as follows:
Outline letter
E
F
X
2
Descriptive designator
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
CQCC2-N20
CQCC1-N20
Terminals
16
16
20
20
Package style
Dual-in-line
Flat pack
Square leadless chip carrier
Square leadless chip carrier
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in
improving this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN:
DSCC-VAS, P. O. Box 3990, Columbus, OH 43216-5000, by using the self addressed Standardization
Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
AMSC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5962
MIL-M-38510/316E
1.3 Absolute maximum ratings.
Supply voltage range .............................................................................
Input voltage range ................................................................................
Storage temperature range ....................................................................
Maximum power dissipation (PD) 1/
Device types 01 and 04 ....................................................................
Device type 02 .................................................................................
Device type 03 .................................................................................
Lead temperature (soldering, 10 seconds) .............................................
Thermal resistance, junction to case (θJC):
Cases E, F, X, and 2 ............................................................................
Junction temperature (TJ) 2/...................................................................
-0.5 V to 7.0 V
-1.5 V at -18 mA to 5.5 V
-65° to +150°C
66 mW
38.5 mW
198 mW
300°C
(See MIL-STD-1835)
+175°C
1.4 Recommended operating conditions.
Supply voltage (VCC) ..............................................................................
Minimum high level input voltage (VIH) ...................................................
Maximum low level input voltage (VIL) ....................................................
Normalized fanout (each output) ............................................................
Case operating temperature range (TC) .................................................
Setup time, t(SETUP):
Data to enable:
Device types 01 and 04 .............................................................
Data to enable ↑ :
Device type 03 ...........................................................................
Device type 05 ...........................................................................
Address to enable ↓ :
Device type 03 ...........................................................................
Device type 05 ...........................................................................
Input hold time, t(HOLD):
Data to enable:
Device type 01 and 04 ...............................................................
Data to enable ↑ :
Device type 03 ...........................................................................
Device type 05 ...........................................................................
Address to enable ↓ :
Device type 03 ...........................................................................
Device type 05 ...........................................................................
4.5 V minimum to 5.5 V maximum
2.0 V
0.7 V
10 maximum
-55°C to +125°C
20 ns minimum
17 ns minimum
24 ns minumum
15 ns minimum
0 ns minimum
o ns minimum
5 ns minimum
0 ns minimum
15 ns minimum
0 ns minimum
NOTE: Refers to rising ↑ or falling ↓ edge of the enable pulse.
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening
conditions in accordance with MIL-PRF-38535.
2
MIL-M-38510/316E
2. APPLICABLE DOCUMENTS
2.1 Government documents.
2.1.1 Specifications and Standards. The following specifications and standards form a part of this specification to the
extent specified herein. Unless otherwise specified, the issues of these documents shall be those listed in the issue of
the Departments of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
MIL-STD-1835
-
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outlines
(Unless otherwise indicated, copies of the above specifications and standards are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and
regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract
award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM
plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Truth table. The truth table shall be as specified on figure 2.
3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3
MIL-M-38510/316E
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and
apply over the full recommended case operating temperature range, unless otherwise specified.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 10
(see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect
the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to
qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters
test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with MILPRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
4
MIL-M-38510/316E
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
-55°C ≤ TC ≤ +125°C
High level output voltage
VOH
Low level output voltage
VOL
Input clamp voltage
VI C
Low level input current:
IIL1
At data
VCC = 4.5 V, VIH = 2.0 V
VIL = 0.7 V, IOH = -400 µA
VCC = 4.5 V, VIH = 2.0 V
VIL = 0.7 V, IOL = 4 mA
VCC = 4.5 V, IIN = -18 mA,
TC = +25°C
VCC = 5.5 V, VIN = 0.4 V
At S , R
At all inputs
Low level input current
IIL2
enable
High level input current:
IIH1
At data
VCC = 5.5 V, VIN = 0.4 V
VCC = 5.5 V, VIN = 2.7 V
Unit
Max
2.5
V
All
0.4
V
All
-1.5
V
mA
01
04
02
-.03
-.0005
0
-0.42
-0.4
-0.4
03, 05
01
04
01, 04
-.005
-.06
0
-0.72
-1.6
-1.6
20
mA
µA
20
VCC = 5.5 V, VIN = 2.7 V
03, 05
01, 04
20
80
µA
VCC = 5.5 V, VIN = 5.5 V
01, 04
100
µA
02
100
03, 05
01, 04
100
400
µA
-100
mA
mA
At S , R
At all inputs
High level input current
IIH4
enable
Short circuit output current IOS
All
Limits
Min
02
At S , R
At all inputs
High level input current
IIH2
enable
High level input current:
IIH3
At data
Device
type
VCC = 5.5 V, VIN = 5.5 V
VCC = 5.5 V 1/
All
Supply current
ICC
VCC = 5.5 V
Low to high level, from
D input to Q output
High to low level, from
D input to Q output
Low to high level, from
tPLH1
CL = 50 pF ±10%, RL = 2 kΩ ±5%
VCC = 5.0 V
-15
01, 04
02
03, 05
01, 04
3
12
7
36
42
tPHL1
01, 04
3
29
ns
tPLH2
01, 04
3
32
ns
tPHL2
01, 04
3
26
ns
tPLH3
01, 04
3
42
ns
tPHL3
01, 04
3
39
ns
ns
D input to Q output
High to low level, from
D input to Q output
Low to high level, from
enable input to Q output
High to low level, from
enable input to Q output
1/ Not more than one output should be shorted at one time.
5
MIL-M-38510/316E
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions
Device
type
Min
Max
01, 04
3
46
ns
tPHL4
01, 04
3
26
ns
tPLH1
02
3
35
ns
tPHL1
02
3
26
ns
tPHL2
02
3
42
ns
tPHL1
03
05
03
05
03
05
03
05
03
05
03
05
03, 05
3
3
3
3
3
3
3
3
3
3
3
3
3
42
30
48
46
34
33
56
42
44
42
52
38
38
ns
-55°C ≤ TC ≤ +125°C
Low to high level, from
enable input to Q output
High to low level, from
enable input to Q output
Low to high level, from
tPLH4
CL = 50 pF ±10%, RL = 2 kΩ ±5%
VCC = 5.0 V
Limits
Unit
S input to Q output
High to low level, from
S input to Q output
High to low level, from
R input to Q output
High to low level, from
clear input to Q output
Low to high level, from
data input to Q output
High to low level, from
data input to Q output
Low to high level, from
address input to Q output
High to low level, from
address input to Q output
Low to high level, from
enable input to Q output
High to low level, from
enable input to Q output
tPLH2
tPHL2
tPLH3
tPHL3
tPLH4
tPHL4
6
ns
ns
ns
ns
ns
ns
MIL-M-38510/316E
TABLE II. Electrical test requirements.
Subgroups (see table III)
Class S
Class B
devices
devices
1
1
MIL-PRF-38535
test requirements
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Group B electrical test parameters
when using method 5005 QCI option
Group C end-point electrical parameters
Group D end-point electrical parameters
1*, 2, 3, 7, 9,
10, 11
1, 2, 3, 7, 8,
9, 10, 11
1, 2, 3, 9,
10, 11
1, 2, 3, 9,
10, 11
1, 2, 3
1*, 2, 3, 7, 9
1, 2, 3, 7, 8,
9, 10, 11
N/A
1, 2, 3
1, 2, 3
*PDA applies to subgroup 1.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are
conventional and positive when flowing into the referenced terminal.
7
MIL-M-38510/316E
Pin
number
Pin symbol
Device type 01
Case
Case
2, X
E, F
Pin symbol
Device type 02
Case
Case
2, X
E, F
Pin symbol
Device type 03
Case
Case
2, X
E, F
Pin symbol
Device type 04
Case
Case
2, X
E, F
Pin symbol
Device type 05
Case
Case
2, X
E, F
1
NC
1Q
NC
1R
NC
A
NC
1D
NC
A
2
1Q
1D
1R
1S 1
A
B
1D
1Q
A
B
3
1D
2D
1S 1
1S 2
B
C
1Q
1Q
B
C
4
2D
ENBL 3-4
1S 2
1Q
C
Q0
1Q
ENBL 1-2
C
Q0
5
ENBL 3-4
VCC
1Q
2R
Q0
Q1
ENBL 1-2
2Q
Q0
Q1
6
NC
3D
NC
2S
NC
Q2
NC
2Q
NC
Q2
7
VCC
4D
2R
2Q
Q1
Q3
2Q
2D
Q1
Q3
8
3D
4Q
2S
GND
Q2
GND
2Q
GND
Q2
GND
9
10
4D
4Q
3Q
2Q
GND
3Q
3R
Q3
GND
Q4
Q5
2D
GND
3D
4Q
3Q
Q3
GND
Q4
Q5
11
NC
3Q
NC
3S 1
NC
Q6
NC
3Q
NC
Q6
12
4Q
GND
3Q
3S 2
Q4
Q7
3D
ENBL 3-4
Q4
Q7
13
3Q
ENBL 1-2
3R
4Q
Q5
DATA IN
3Q
4Q
Q5
DATA IN
14
3Q
2Q
3S 1
4R
Q6
ENBL
3Q
4Q
Q6
ENBL
15
GND
2Q
3S 2
4S
Q7
CLR
ENBL 3-4
4D
Q7
CLR
16
17
18
NC
ENBL 1-2
1Q
NC
4Q
VCC
NC
DATA IN
VCC
NC
4Q
VCC
NC
DATA IN
VCC
19
2Q
20
1Q
2Q
4R
ENBL
4Q
ENBL
4S
CLR
4D
CLR
VCC
VCC
VCC
VCC
FIGURE 1. Terminal connections.
8
MIL-M-38510/316E
Device type 01 and 04
Inputs
Outputs
D
Enable
Q
Q
L
H
L
H
H
H
H
L
X
L
Q0
Q0
H = high level, L = low level, X = irrelevant
Q0 = the level of Q before the high-to-low transition of enable
Device type 02
Inputs
Outputs
S†
R
Q
H
H
Q0
L
H
H
H
L
L
L
L
H*
H = high level, L = low level, Q0 = the level of Q before the indicated
input conditions were established.
* This output level is pseudo stable; that is, it may not persist when the
S and R inputs return to their inactive (high) level.
† For latches with double S inputs:
H = both S inputs high
L = one or both S inputs low
FIGURE 2. Truth tables.
9
MIL-M-38510/316E
Device type 03 and 05
Inputs
Output of
addressed
latch
Each
other
output
Function
Clear
Enable
H
L
D
Qio
H
H
Qio
Qio
L
L
D
L
8-line demultiplexer
L
H
L
L
Clear
Addressable latch
Memory
Latch Selection Table
Select inputs
Latch
C
B
A
addressed
L
L
L
0
L
L
H
1
L
H
L
2
L
H
H
3
H
L
L
4
H
L
H
5
H
H
L
6
H
H
H
7
H = high level, L = low level
Q = the level at the data input
Qio = the level of Qi (i = 0,1,….,7, as appropriate) before
the indicated steady-state input conditions were established.
FIGURE 2. Truth tables - Continued.
10
MIL-M-38510/316E
FIGURE 3. Switching test circuit and waveforms for device types 01 and 04.
11
MIL-M-38510/316E
NOTES:
1. The D input pulse generator has the following characteristics: VGEN = 3 V, t0 ≤ 15 ns, t1 ≤ 6 ns, tP = 30 ns,
and ZOUT = 50Ω except when measuring VSETUP.
2. The enable pulse generator is identical to the D input pulse generator.
3. CL = 50 pF ±10% and includes probe and jig capacitance.
4. RL = 2 kΩ ±5 percent.
5. All diodes are 1N3064 or equivalent.
6. VSETUP is to be measured 500 ns minimum after input transitions to assure that the device has latched with
minimum setup and maximum hold conditions applied to inputs.
FIGURE 3. Switching test circuit and waveforms for device types 01 and 04 - Continued.
12
MIL-M-38510/316E
NOTES:
1. R and S pulse generator has the following characteristics: tP = 40 ±10 ns, t0 ≤ 15 ns, t1 ≤ 6 ns,
and PRR ≤ 1.0 MHz.
2. CL = 50 pF ±10% and includes probe and jig capacitance.
3. RL = 2 kΩ ±5 percent.
4. All diodes are 1N3064 or equivalent.
FIGURE 4. Switching test circuit and waveforms for device type 02.
13
MIL-M-38510/316E
NOTE: For Q0 output waveform is inverted and tPLH3 and tPHL3 are interchanged.
FIGURE 5. Switching test circuit and waveforms for device types 03 and 05
14
MIL-M-38510/316E
NOTES:
1. RL = 2 kΩ ±5 percent.
2. CL = 50 pF ±10% and includes probe and jig capacitance.
3. All loads are the same as the Q0 load.
4. All diodes are 1N3064 or equivalent.
5. The clear, enable, data, and address pulse generator have the following characteristics: VGEN = 3 V, t0 ≤ 15 ns,
t1 ≤ 6 ns, tP = 30 ns, and PRR ≤ 1 MHz except when measuring test nos. 152 thru 193, tP(ENABLE) = 17 ns,
tP(DATA) = 22 ns, tP(ADDRESS) = 47 ns, and tSETUP and tHOLD are as specified on the waveforms above.
6. Immediately prior to test 152, all outputs shall be cleared low; then beginning with test 152, test 152 thru 193 are
to be performed in sequence with a wait of 500 ns minimum between each test. These tests are to assure latchup
of the outputs under worst case setup and hold input conditions.
FIGURE 6. Switching test circuit and waveforms for device type 03 - Continued.
15
MIL-M-38510/316E
NOTES:
1. RL = 2 kΩ ±5 percent.
2. CL = 50 pF ±10% and includes probe and jig capacitance.
3. All loads are the same as the Q0 load.
4. All diodes are 1N3064 or equivalent.
5. The clear, enable, data, and address pulse generator have the following characteristics: VGEN = 3 V, t0 ≤ 15 ns,
t1 ≤ 6 ns, tP = 30 ns, and PRR ≤ 1 MHz except when measuring test nos. 152 thru 193, tP(ENABLE) = 24 ns,
tP(DATA) = 24 ns, tP(ADDRESS) = 24 ns, and tSETUP and tHOLD are as specified on the waveforms above.
6. Immediately prior to test 152, all outputs shall be cleared low; then beginning with test 152, test 152 thru 193 are
to be performed in sequence with a wait of 500 ns minimum between each test. These tests are to assure latchup
of the outputs under worst case setup and hold input conditions.
FIGURE 5. Switching test circuit and waveforms for device type 05 - Continued.
16
TABLE III. Group A inspection for device type 01 and 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
MIL-STD-
Type 01
Cases
E, F
Cases
2, X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Type 04
Cases
E, F
Cases
2, X
2
1
7
12
16
9
15
14
13
11
10
8
4
6
5
3
3
2
9
15
20
12
19
18
17
14
13
10
5
8
7
4
1D
2D
EN 3-4
VCC
3D
4D
4Q
3Q
2Q
1Q
Symbol
883
method
1
VOH
3006
1
"
"
2
3
"
"
4
5
"
"
6
7
"
3007
8
9
"
"
10
11
"
"
12
13
"
"
14
15
"
3009
"
"
"
"
"
3010
"
"
"
"
"
"
"
"
"
"
"
3011
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
"
"
36
37
"
"
38
39
"
"
40
41
"
3005
42
43
Test no.
Tc = 25°C
VOL
IIL1
17
IIL2
IIH1
IIH2
IIH3
IIH4
IOS
ICC
1Q
-0.4 mA
GND
EN 1-2
0.7 V
4.5 V
GND
1/
2.0 V
"
"
"
"
"
"
"
"
"
0.7 V
2.0 V
4 mA
1/
"
"
"
"
"
"
0.7 V
0.7 V
1/
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.4 V
0.4 V
4.5 V
4.5 V
4.5 V
0.4 V
2.7 V
2.7 V
2.7 V
5.5 V
5.5 V
5.5 V
GND
GND
4.5 V
4.5 V
GND
See footnotes at end of device type 01 and 04.
-0.4 mA
2.0 V
-0.4 mA
0.7 V
2.0 V
-0.4 mA
2.0 V
4 mA
0.7 V
4 mA
2.0 V
4 mA
4.5 V
"
"
0.4 V
4.5 V
2.7 V
2.7 V
5.5 V
5.5 V
"
"
"
"
"
GND
"
"
GND
GND
4.5 V
GND
GND
GND
4.5 V
GND
GND
GND
-0.4 mA
4Q
1/
"
"
"
"
"
"
"
4Q
4 mA
4 mA
V
"
"
"
"
"
"
"
"
"
"
"
0.4
"
"
"
"
"
"
"
"
"
"
"
"
"
"
-15
"
4/
"
"
"
"
"
20
"
"
"
80
80
100
"
"
"
0.4
0.4
-100
"
mA
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
12
"
"
1Q
1Q
2Q
4Q
4Q
1D
2D
3D
4D
EN 1-2
EN 3-4
1D
2D
3D
4D
EN 1-2
EN 3-4
1D
2D
3D
4D
EN 1-2
EN 3-4
4.5 V
4.5 V
0.4 V
2.7 V
5.5 V
4.5 V
"
"
"
"
"
GND
GND
1Q
1Q
2Q
GND
2Q
3Q
"
"
3Q
4Q
GND
4Q
VCC
Max
"
"
2Q
4 mA
Unit
2.5
3Q
3Q
"
"
"
"
1Q
1Q
2Q
2Q
-0.4 mA
Limits
Min
3Q
3Q
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.4 V
4.5 V
-0.4 mA
"
"
4 mA
0.7 V
2Q
"
"
-0.4 mA
"
"
GND
GND
3Q
"
"
2.0 V
4.5 V
0.7 V
"
"
2.0 V
4Q
Measured
terminal
4/
"
"
"
"
"
MIL-M-38510/316E
Subgroup
TABLE III. Group A inspection for device type 01 and 04 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Type 01
Cases
E, F
Cases
2, X
MIL-STDSubgroup
Symbol
1
Tc = 25°C
VI c
883
method
Type 04
Cases
E, F
Cases
2, X
Test no.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
2
1
7
12
16
9
15
14
13
11
10
8
4
6
5
3
3
2
9
15
20
12
19
18
17
14
13
10
5
8
7
4
1D
2D
EN 3-4
VCC
3D
4D
4Q
3Q
GND
EN 1-2
2Q
1Q
1Q
4Q
tPLH1
tPHL2
"
"
56
57
tPLH1
tPHL2
"
"
58
59
4.5 V
"
"
"
tPLH1
tPHL2
"
"
60
61
"
"
"
"
tPHL1
tPLH2
"
"
62
63
tPHL1
tPLH2
"
"
64
65
tPHL1
tPHL2
"
"
66
67
4.5 V
"
"
"
tPHL1
tPLH2
"
"
68
69
"
"
"
"
tPLH3
"
"
"
"
"
"
"
"
"
70
71
72
73
74
75
76
77
78
"
79
"
80
IN
"
"
81
IN
"
tPHL3
tPLH4
IN
IN
OUT
IN
IN
4.5 V
4.5 V
IN
IN
GND
GND
IN
IN
GND
GND
See footnotes at end of device types 01 and 04.
GND
"
"
"
"
"
H
"
"
L
H
"
"
L
L
"
"
H
"
"
IN
IN
OUT
3Q
IN
IN
OUT
OUT
IN
IN
OUT
-18 mA
GND
"
"
"
A
B
B
A
GND
"
4.5 V
"
"
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
4.5 V
OUT
GND
OUT
GND
OUT
"
GND
OUT
GND
OUT
OUT
OUT
OUT
OUT
OUT
2D to 2 Q
3D to 3Q
3D to 3 Q
4D to 4Q
4D to 4 Q
"
"
"
"
"
"
"
"
"
IN
"
IN
"
4D to 4 Q
1D to 1Q
1D to 1 Q
2D to 2Q
"
"
"
1D to 1Q
2D to 2 Q
OUT
IN
IN
OUT
OUT
IN
IN
OUT
OUT
EN to 1Q
EN to 2Q
EN to 3Q
EN to 4Q
EN to 1Q
EN to 2Q
EN to 3Q
EN to 4Q
EN to 1 Q
OUT
Unit
Max
-1.5
"
"
"
"
"
V
"
"
"
"
"
3
"
32
20
ns
"
"
"
32
20
"
"
"
"
32
20
"
"
"
"
32
20
"
"
"
"
22
25
"
"
"
"
22
25
"
"
"
"
22
25
"
"
"
"
22
25
"
"
"
"
"
"
"
"
"
"
"
32
"
"
"
30
"
"
"
35
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3/
"
"
"
1D to 1 Q
2D to 2Q
"
"
OUT
4.5 V
H
"
"
L
3D to 3Q
4.5 V
"
"
"
"
"
"
"
"
"
"
H
"
"
L
3D to 3 Q
4D to 4Q
"
"
IN
IN
L
"
"
H
"
"
"
"
OUT
Min
1D
2D
3D
4D
EN 1-2
EN 3-4
"
"
OUT
IN
IN
2Q
Limits
EN to 2 Q
EN to 3 Q
EN to 4 Q
MIL-M-38510/316E
18
44
-18 mA
4.5 V
45
-18 mA
"
46
"
-18 mA
47
"
-18 mA
48
"
49
-18 mA
"
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = +125°C and VI C tests are omitted.
3
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55°C and VI C tests are omitted.
7 2/
Truth
3014
50
L
A
A
A
5.0 V
A
A
L
"
51
"
A
A
B
"
A
A
"
Tc = 25°C table
tests
"
52
"
B
B
B
"
B
B
"
"
53
H
B
B
A
"
B
B
H
8
Same tests and terminal conditions as for subgroup 7 except TC = +125°C and TC = -55°C.
9
tPLH1
3003
54
IN
5.0 V
Fig. 4
55
OUT
IN
"
Tc = 25°C tPHL2
Measured
terminal
TABLE III. Group A inspection for device type 01 and 04 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
MIL-STD-
Type 01
Cases
E, F
Cases
2, X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Type 04
Cases
E, F
Cases
2, X
2
1
7
12
16
9
15
14
13
11
10
8
4
6
5
3
3
2
9
15
20
12
19
18
17
14
13
10
5
8
7
4
1D
2D
EN 3-4
VCC
3D
4D
4Q
3Q
2Q
1Q
Subgroup
Symbol
883
method
9
tPHL4
3003
82
Fig. 3
83
"
84
Test no.
Tc = 25°C
VSUH
10
TC =125°C
19
11
85
86
87
88
89
90
91
92
93
4.5 V
4.5 V
IN
IN
IN
IN
IN
IN
IN
IN
GND
EN 1-2
5.0 V
GND
IN
"
"
IN
"
4.5 V
"
"
"
"
"
"
"
"
"
4Q
OUT
4.5 V
OUT
OUT
IN
1/ Apply 0V/3V - 5V/0V momentary pulse 500 ns minimum prior to measurement.
2/ A = 2.4 V, B = 0.4 V.
3/ H ≥ 1.5 V, L ≤ 1.5 V.
4/ IIL limits are as follows:
Circuit A, B
IIL1
IIL2
-.16/-.40
-.64/-1.60
Min/max limits (mA)
Circuit C
Circuit D
Device 01
Device 04
-.0005/-.40
-.03/-.40
-.16/-.40
0/-1.20
-.12/-1.20
-.64/-1.60
Circuit E
-.19/-.42
-.75/-1.60
2Q
EN to 1 Q
OUT
EN to 2 Q
"
EN to 3 Q
"
IN
IN
IN
IN
IN
tPLH1
tPHL1
tPLH2
tPHL2
Same tests and terminal conditions as for subgroup 9, except TC = +125°C and test limits as shown
tPLH3
tPHL3
tPLH4
tPHL4
VSUH
VSUL
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
Test
3Q
OUT
OUT
OUT
"
"
"
"
"
"
"
"
IN
IN
OUT
OUT
IN
IN
OUT
OUT
EN to 4 Q
1Q
2Q
3Q
4Q
1Q
2Q
3Q
4Q
Limits
Unit
Min
Max
3
20
ns
"
"
"
"
"
"
"
"
2.5
"
"
"
"
"
"
"
3
"
"
"
"
"
"
"
2.5
0.4
"
"
"
42
29
32
26
42
39
46
26
0.4
"
V
"
"
"
"
"
"
"
ns
"
"
"
"
"
"
"
V
V
MIL-M-38510/316E
VSUL
"
"
"
"
"
"
"
"
"
1Q
OUT
Measured
terminal
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
1R
1S 1
1S 2
2R
2S
2Q
GND
3Q
3R
3S 1
3S 2
4R
4S
2.0 V
1/
Symbol
883
method
1
Tc = 25°C
VOH
3006
"
"
"
3007
"
"
"
3009
1
2
3
4
5
6
7
8
9
"
10
GND
"
11
GND
"
12
0.4 V
"
13
GND
"
14
"
0.4 V
"
15
"
GND
"
16
"
GND
"
17
"
0.4 V
GND
"
"
18
"
GND
0.4 V
"
3010
19
"
20
"
21
"
22
"
23
"
24
"
"
25
"
"
26
"
"
27
"
"
28
"
"
29
"
30
"
31
"
32
"
33
"
34
"
"
35
"
"
36
"
"
37
"
"
38
"
Test no.
VOL
IIL1
IIH1
20
IIH3
2.0 V
1/
1Q
4Q
VCC
GND
GND
"
"
"
"
"
"
"
"
0.4 V
4.5 V
"
"
4.5 V
0.4 V
"
"
GND
"
"
0.4 V
"
"
2.0 V
2.0 V
0.4 V
1/
2.0 V
2.0 V
1/
-0.4 mA
1/
2.0 V
4 mA
-0.4 mA
4 mA
2.7 V
2.7 V
2.7 V
2.7 V
2.7 V
5.5 V
5.5 V
See footnotes at end of device type 02.
5.5 V
5.5 V
5.5 V
-0.4 mA
-0.4 mA
4 mA
2.0 V
1/
2.0 V
2.0 V
1/
2.0 V
4 mA
1/
2.0 V
4.5 V
"
"
"
"
"
"
"
5.5 V
GND
"
0.4 V
4.5 V
"
4.5 V
0.4 V
"
"
"
"
"
"
"
"
"
"
"
2.7 V
"
2.7 V
"
2.7 V
"
2.7 V
"
2.7 V
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
5.5 V
"
5.5 V
"
5.5 V
"
5.5 V
Measured
terminal
"
Limits
Min
4Q
3Q
2Q
1Q
1Q
2Q
3Q
4Q
1R
1S 1
1S 2
2R
2S
3R
3S 1
3S 2
4R
4S
1R
1S 1
1S 2
2R
2S
3R
3S 1
3S 2
4R
4S
1R
1S 1
1S 2
2R
2S
3R
3S 1
3S 2
4R
4S
Unit
Max
2.5
"
"
"
4/
0.4
"
"
"
4/
V
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
20
µA
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
MIL-M-38510/316E
Subgroup
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
1R
1S 1
1S 2
2R
2S
2Q
GND
3Q
3R
3S 1
3S 2
4R
4S
5.0 V
GND
GND
Subgroup
Symbol
883
method
1
Tc = 25°C
IOS
3011
"
"
"
3005
Test no.
ICC
VI C
39
40
41
42
43
44
GND
-18 mA
45
4.5 V
1Q
GND
4.5 V
5.0 V
GND
GND
4.5 V
GND
-18 mA
46
-18 mA
47
-18 mA
48
-18 mA
GND
"
"
"
"
"
5.0 V
GND
GND
4.5 V
"
"
"
51
"
52
"
53
"
-18 mA
"
-18 mA
"
-18 mA
"
-18 mA
H
L
L
H
H
B
B
A
"
"
B
A
A
B
A
B
A
"
"
B
H
L
L
H
H
B
B
A
"
"
"
-18 mA
"
B
A
A
B
B
5.0 V
"
"
"
"
5.0 V
Fig. 4
60
"
61
"
62
"
OUT
GND
IN
4.5 V
"
"
63
"
OUT
GND
4.5 V
IN
"
"
64
"
"
65
GND
IN
4.5 V
OUT
"
"
"
66
GND
4.5 V
IN
OUT
"
"
"
67
"
"
"
68
"
OUT
GND
IN
4.5 V
"
"
69
"
OUT
GND
4.5 V
IN
"
"
70
"
GND
See footnotes at end of device type 02.
GND
IN
IN
OUT
OUT
"
"
"
"
OUT
OUT
GND
GND
IN
IN
"
"
1Q
2Q
3Q
4Q
VCC
Limits
Unit
Min
Max
-15
"
"
"
-100
"
"
"
7
-1.5
mA
"
"
"
"
V
"
"
1R
1S 1
1S 2
2R
2S
3R
3S 1
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3
27
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
20
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3S 2
4R
4S
3/
"
"
"
"
1 S 1 to 1Q
1 S 2 to 1Q
2 S to 2Q
3 S 1 to 3Q
3 S 2 to 3Q
4 S to 4Q
1 S 1 to 1Q
1 S 2 to 1Q
2 S to 2Q
3 S 1 to 3Q
3 S 2 to 3Q
4 S to 4Q
MIL-M-38510/316E
21
tPHL1
GND
"
"
OUT
4.5 V
"
50
IN
GND
4.5 V
"
"
4.5 V
GND
GND
"
49
GND
5.0 V
VCC
5.5 V
"
"
"
"
4.5 V
"
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = +125°C and VI C tests are omitted.
3
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55°C and VI C tests are omitted.
7 2/
Truth
3014
54
B
B
B
H
B
B
H
GND
"
55
B
A
A
L
B
A
L
"
Tc = 25°C table
tests
"
56
A
A
"
L
A
A
L
"
"
57
"
B
"
H
"
B
H
"
"
58
"
A
B
H
"
B
H
"
8
Same tests and terminal conditions as for subgroup 7 except TC = +125°C and TC = -55°C.
9
tPLH1
3003
59
GND
IN
4.5 V
OUT
GND
Tc = 25°C
GND
4Q
Measured
terminal
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
1R
1S 1
1S 2
2R
2S
2Q
GND
3Q
3R
3S 1
3S 2
4R
4S
IN
4.5 V
4.5 V
Subgroup
Symbol
883
method
9
tPHL2
3003
71
Fig. 4
72
"
73
"
"
74
"
Test no.
Tc = 25°C
10
TC =125°C
11
1Q
OUT
IN
4.5 V
Unit
VCC
Min
Max
5.0 V
3
32
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
35
26
42
"
"
"
OUT
IN
4.5 V
4.5 V
"
OUT
tPLH1
tPHL1
Same tests and terminal conditions as for subgroup 9, except TC = +125°C and test limits as shown
tPHL2
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
1/ Apply a 3V - 5V
Limits
GND
OUT
4Q
Measured
terminal
IN
4.5 V
"
1 R to 1Q
2 R to 2Q
3 R to 3Q
4 R to 4Q
momentary pulse 500 ns minimum prior to measurement.
0V
3/ H ≥ 1.5 V, L ≤ 1.5 V.
4/ IIL limits are as follows:
Test
IIL
Circuit A
Tests
9, 12,
14, 17
10, 11, 13
15, 16, 18
Circuit B
Limits
0/-0.2
0/-0.2
-.16/-.40
Min/max limits (mA)
Circuit C
-.135/-.370
Circuit D
Tests
Limits
9, 12,
-.001/-.15
14, 17
10, 11, 13
-.03/-.30
15, 16, 18
Circuit E
-.16/-.40
MIL-M-38510/316E
22
2/ A = 2.4 V, B = 0.4 V.
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
DATA
IN
2.0 V
"
"
"
"
"
"
"
0.7 V
"
"
"
"
"
"
"
Symbol
883
method
Test no.
A
B
C
Q0
1
Tc = 25°C
VOH
3006
"
"
"
"
"
"
"
3007
"
"
"
"
"
"
"
3009
"
"
"
"
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.4 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
"
"
"
2.0 V
"
"
"
0.7 V
"
"
"
2.0 V
"
"
"
-0.4 mA
"
22
3010
"
"
"
"
23
24
25
26
27
"
28
"
"
"
"
"
29
30
31
32
33
"
34
VOL
IIL1
23
IIH1
IIH3
VI C
35
36
37
38
39
-0.4 mA
-0.4 mA
-0.4 mA
4 mA
4 mA
4 mA
4 mA
0.4 V
0.4 V
ICC
3011
"
"
"
"
"
"
"
3005
41
42
43
44
45
46
47
48
49
-0.4 mA
-0.4 mA
-0.4 mA
-0.4 mA
4 mA
4 mA
4 mA
4 mA
ENBL
CLR
1/
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
2.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.4 V
0.4 V
"
2.7 V
0.4 V
"
"
"
"
"
2.7 V
2.7 V
5.5 V
2.7 V
2.7 V
"
"
"
"
"
5.5 V
5.5 V
-18 mA
5.5 V
5.5 V
"
"
"
"
"
-18 mA
-18 mA
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
See footnotes at end of device type 05.
GND
"
"
"
5.0 V
"
"
"
GND
GND
GND
GND
GND
"
"
"
"
"
"
"
"
"
-18 mA
GND
GND
GND
GND
5.0 V
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
-18 mA
"
"
"
"
"
"
"
5.5 V
"
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
2.7 V
"
40
IOS
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Measured
terminal
-18 mA
"
5.0 V
"
"
"
"
"
"
"
GND
5.5 V
"
"
"
"
"
"
"
"
Limits
Min
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
A
B
C
DATA IN
ENBL
CLR
Max
2.5
"
"
"
"
"
"
"
4/
"
"
"
"
"
A
B
C
DATA IN
ENBL
CLR
A
B
C
DATA IN
ENBL
CLR
A
B
C
DATA IN
ENBL
CLR
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
VCC
Unit
-15
"
"
"
"
"
"
"
0.4
"
"
"
"
"
"
"
4/
"
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
20
"
"
"
"
µA
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
"
"
"
-1.5
"
"
"
"
V
"
"
"
"
"
"
-100
"
"
"
"
"
"
"
36
mA
"
"
"
"
"
"
"
"
MIL-M-38510/316E
Subgroup
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Subgroup
Symbol
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
883
method
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Test no.
A
B
C
Q0
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
DATA
IN
ENBL
CLR
VCC
Min
L
"
"
"
"
"
"
"
"
H
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
H
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
H
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
"
"
"
"
"
"
"
B
A
A
B
A
A
B
A
A
B
A
A
B
A
A
B
A
A
B
A
A
B
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3/
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
2
Same tests, terminal conditions, and limits as for subgroup 1 except TC = +125°C and VI C tests are omitted.
3
Same tests, terminal conditions, and limits as for subgroup 1 except TC = -55°C and VI C tests are omitted.
7 2/
Truth
3014
50
B
B
B
L
L
L
L
GND
"
51
B
"
"
H
"
"
"
"
Tc = 25°C table
tests
"
52
A
"
"
L
"
"
"
"
"
53
A
"
"
"
H
"
"
"
"
54
B
A
"
"
L
"
"
"
"
55
B
"
"
"
"
H
"
"
"
56
A
"
"
"
"
L
"
"
"
57
A
"
"
"
"
"
H
"
"
58
B
B
A
"
"
"
L
"
"
59
B
"
"
"
"
"
"
"
"
60
A
"
"
"
"
"
"
"
"
61
A
"
"
"
"
"
"
"
"
62
B
A
"
"
"
"
"
"
"
63
B
"
"
"
"
"
"
"
"
64
A
"
"
"
"
"
"
"
"
65
"
"
"
"
"
"
"
"
"
66
"
"
"
"
"
"
"
"
"
67
B
"
"
"
"
"
"
"
"
68
A
B
"
"
"
"
"
"
"
69
B
B
"
"
"
"
"
"
"
70
A
A
B
"
"
"
"
"
"
71
B
A
"
"
"
"
"
"
"
72
A
B
"
"
"
"
"
"
"
73
B
"
"
"
"
"
"
"
"
74
"
"
"
H
"
"
"
"
"
75
"
"
"
"
"
"
"
"
"
76
A
"
"
"
"
"
"
"
"
77
"
"
"
"
H
"
"
"
"
78
"
"
"
"
"
"
"
"
"
79
B
A
"
"
"
"
"
"
"
80
"
"
"
"
"
H
"
"
"
81
"
"
"
"
"
"
"
"
"
82
A
"
"
"
"
"
"
"
"
83
"
"
"
"
"
"
H
"
"
84
"
"
"
"
"
"
"
"
"
85
B
B
A
"
"
"
"
"
"
86
"
"
"
"
"
"
"
"
"
87
"
"
"
"
"
"
"
"
"
88
A
"
"
"
"
"
"
"
"
89
"
"
"
"
"
"
"
"
"
90
"
"
"
"
"
"
"
"
"
91
B
A
"
"
"
"
"
"
"
92
"
"
"
"
"
"
"
"
"
93
"
"
"
"
"
"
"
"
"
94
A
"
"
"
"
"
"
"
"
95
A
"
"
"
"
"
"
"
8
Same tests and terminal conditions as for subgroup 7 except TC = +125°C and TC = -55°C.
See footnotes at end of device type 05.
"
Measured
terminal
Limits
Unit
Max
MIL-M-38510/316E
24
Cases
E, F
1
MIL-STD-
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
DATA
IN
4.5 V
ENBL
CLR
VCC
Min
Max
GND
6/
IN
5.0 V
3
32
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
37
"
"
"
"
"
"
"
26
"
"
"
"
"
"
"
43
"
"
"
"
"
"
"
34
"
"
"
"
"
"
"
39
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Subgroup
Symbol
883
method
Test no.
A
B
C
Q0
9
tPLH1
3003
96
GND
GND
GND
OUT
Fig. 5
97
4.5 V
GND
"
"
98
GND
4.5 V
"
Tc = 25°C
tPLH2
tPHL2
tPLH3
tPHL3
tPLH4
OUT
OUT
"
99
4.5 V
4.5 V
"
"
100
GND
GND
4.5 V
"
"
101
4.5 V
GND
"
"
"
102
GND
4.5 V
"
"
"
103
4.5 V
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
IN
IN
GND
IN
GND
IN
GND
IN
IN
IN
GND
IN
GND
IN
GND
IN
GND
GND
GND
4.5 V
4.5 V
GND
GND
4.5 V
4.5 V
GND
GND
4.5 V
4.5 V
GND
GND
4.5 V
4.5 V
GND
GND
IN
4.5 V
GND
GND
IN
4.5 V
GND
GND
IN
4.5 V
GND
GND
IN
4.5 V
GND
GND
"
"
"
4.5 V
"
"
"
GND
"
"
"
4.5 V
"
"
"
GND
"
"
"
IN
4.5 V
"
"
GND
"
"
"
IN
4.5 V
"
"
GND
"
137
4.5 V
GND
"
"
138
GND
4.5 V
"
"
139
4.5 V
4.5 V
"
"
140
GND
GND
4.5 V
"
"
141
4.5 V
GND
"
"
"
142
GND
4.5 V
"
"
"
143
4.5 V
4.5 V
"
"
See footnotes at end of device type 05.
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
Measured
terminal
CLR to Q0
CLR to Q1
CLR to Q2
CLR to Q3
CLR to Q4
CLR to Q5
CLR to Q6
CLR to Q7
DI to Q0
DI to Q1
DI to Q2
DI to Q3
DI to Q4
DI to Q5
DI to Q6
DI to Q7
DI to Q0
DI to Q1
DI to Q2
DI to Q3
DI to Q4
DI to Q5
DI to Q6
DI to Q7
A to Q0
A to Q1
B to Q2
A to Q3
C to Q4
A to Q5
B to Q6
A to Q7
A to Q0
A to Q1
B to Q2
A to Q3
C to Q4
A to Q5
B to Q6
A to Q7
ENBL to Q0
ENBL to Q1
ENBL to Q2
ENBL to Q3
ENBL to Q4
ENBL to Q5
ENBL to Q6
ENBL to Q7
Limits
Unit
MIL-M-38510/316E
25
Cases
E, F
1
MIL-STD-
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
GND
DATA
IN
4.5 V
"
Subgroup
Symbol
883
method
Test no.
A
B
C
Q0
9
tPHL4
3003
144
GND
GND
GND
OUT
Fig 6
145
4.5 V
GND
"
"
146
GND
4.5 V
"
"
147
4.5 V
4.5 V
"
"
148
GND
GND
4.5 V
"
"
149
4.5 V
GND
"
"
"
150
GND
4.5 V
"
"
"
151
4.5 V
4.5 V
"
"
tPLH4
" 5/
152
GND
GND
GND
OUT
tPHL4
"
153
"
"
"
tPLH4
"
154
"
"
"
tPLH4
"
155
4.5 V
"
"
tPHL4
"
156
"
"
tPLH4
"
157
"
tPLH4
"
158
tPHL4
"
tPLH4
Measured
terminal
Limits
Unit
CLR
VCC
Min
Max
IN
GND
5.0 V
3
29
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
IN
4.5 V
"
"
39
"
"
"
"
"
"
"
"
29
"
"
"
"
"
"
"
"
39
"
OUT
"
"
"
"
"
"
39
"
"
"
"
"
"
"
"
"
29
"
"
"
"
"
"
"
"
"
"
39
"
GND
4.5 V
"
OUT
"
"
"
"
"
"
39
"
159
"
"
"
"
"
"
"
"
"
"
29
"
"
160
"
"
"
"
"
"
"
"
"
"
39
"
tPLH4
"
161
4.5 V
"
"
OUT
"
"
"
"
"
"
39
"
tPHL4
"
162
"
"
"
"
"
"
"
"
"
"
29
"
tPLH4
"
163
"
"
"
"
"
"
"
"
"
"
39
"
tPLH4
"
164
GND
GND
4.5 V
"
OUT
"
"
"
"
"
39
"
tPHL4
"
165
"
"
"
"
"
"
"
"
"
"
29
"
tPLH4
"
166
"
"
"
"
"
"
"
"
"
"
39
"
tPLH4
"
167
4.5 V
"
"
"
OUT
"
"
"
"
"
39
"
tPHL4
"
168
"
"
"
"
"
"
"
"
"
"
29
"
tPLH4
"
169
"
"
"
"
"
"
"
"
"
"
39
"
tPLH4
"
170
GND
4.5 V
"
"
OUT
"
"
"
"
"
39
"
tPHL4
"
171
"
"
"
"
"
"
"
"
"
"
29
"
tPLH4
"
172
"
"
"
"
"
"
"
"
"
"
39
"
tPLH4
"
173
4.5 V
"
"
"
OUT
"
"
"
"
"
39
"
tPHL4
"
174
"
"
"
"
"
"
"
"
"
"
29
"
tPLH4
"
175
"
"
"
"
"
"
"
"
"
"
39
"
tPHL4
"
176
IN
GND
GND
OUT
"
GND
"
"
"
"
29
"
tPLH4
"
177
"
"
"
"
"
4.5 V
"
"
"
"
39
"
tPHL4
"
178
"
"
"
"
"
GND
"
"
"
"
29
"
TC = 25°C
26
See footnotes at end of device type 05.
OUT
OUT
OUT
OUT
OUT
OUT
OUT
ENBL to Q0
ENBL to Q1
ENBL to Q2
ENBL to Q3
ENBL to Q4
ENBL to Q5
ENBL to Q6
ENBL to Q7
ENBL to Q0
ENBL to Q0
ENBL to Q0
ENBL to Q1
ENBL to Q1
ENBL to Q1
ENBL to Q2
ENBL to Q2
ENBL to Q2
ENBL to Q3
ENBL to Q3
ENBL to Q3
ENBL to Q4
ENBL to Q4
ENBL to Q4
ENBL to Q5
ENBL to Q5
ENBL to Q5
ENBL to Q6
ENBL to Q6
ENBL to Q6
ENBL to Q7
ENBL to Q7
ENBL to Q7
ENBL to Q1
ENBL to Q1
ENBL to Q1
MIL-M-38510/316E
ENBL
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q0
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
883
method
Test no.
A
B
C
9
tPHL4
3003
179
GND
IN
GND
OUT
GND
DATA
IN
GND
TC = 25°C
tPLH4
Fig 6
180
"
"
"
"
"
tPHL4
181
"
"
"
"
"
tPHL4
182
"
GND
IN
"
tPLH4
183
"
"
"
tPHL4
184
"
"
"
tPHL4
185
IN
"
GND
OUT
tPLH4
186
"
"
"
tPHL4
187
"
"
"
tPHL4
188
4.5 V
IN
4.5 V
"
tPLH4
189
"
"
"
tPHL4
190
"
"
"
tPHL4
191
"
4.5 V
IN
OUT
tPLH4
192
"
"
"
tPHL4
193
"
"
"
10
TC =125°C
11
Limits
Unit
ENBL
CLR
VCC
Min
IN
4.5 V
5.0 V
3
29
ns
4.5 V
"
"
"
"
39
"
GND
"
"
"
"
29
"
OUT
GND
"
"
"
"
29
"
"
"
4.5 V
"
"
"
"
39
"
"
"
GND
"
"
"
"
29
"
"
GND
"
"
"
"
29
"
"
"
4.5 V
"
"
"
"
39
"
"
"
GND
"
"
"
"
29
"
OUT
GND
"
"
"
"
29
"
"
"
4.5 V
"
"
"
"
39
"
"
"
GND
"
"
"
"
29
"
"
GND
"
"
"
"
29
"
"
"
4.5 V
"
"
"
"
39
"
"
"
GND
"
"
"
"
29
"
"
"
"
"
"
"
"
42
48
34
56
44
52
38
"
"
"
"
"
"
"
tPHL1
tPLH2
Same tests and terminal conditions as for subgroup 9, except TC = +125°C and test limits as shown
tPHL2
tPLH3
tPHL3
tPLH4
tPHL4
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
See footnotes at end of device type 05.
Measured
terminal
ENBL to Q2
ENBL to Q2
ENBL to Q2
ENBL to Q4
ENBL to Q4
ENBL to Q4
ENBL to Q0
ENBL to Q0
ENBL to Q0
ENBL to Q5
ENBL to Q5
ENBL to Q5
ENBL to Q3
ENBL to Q3
ENBL to Q3
Max
MIL-M-38510/316E
Symbol
27
Subgroup
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
DATA
IN
2.0 V
"
"
"
"
"
"
"
0.7 V
"
"
"
"
"
"
"
Symbol
883
method
Test no.
A
B
C
Q0
1
Tc = 25°C
VOH
3006
"
"
"
"
"
"
"
3007
"
"
"
"
"
"
"
3009
"
"
"
"
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.7 V
2.0 V
0.4 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
0.7 V
2.0 V
2.0 V
0.7 V
"
"
"
2.0 V
"
"
"
0.7 V
"
"
"
2.0 V
"
"
"
-0.4 mA
"
22
3010
"
"
"
"
23
24
25
26
27
"
28
"
"
"
"
"
29
30
31
32
33
"
34
VOL
IIL1
28
IIH1
IIH3
VI C
35
36
37
38
39
-0.4 mA
-0.4 mA
-0.4 mA
4 mA
4 mA
4 mA
4 mA
0.4 V
0.4 V
ICC
3011
"
"
"
"
"
"
"
3005
41
42
43
44
45
46
47
48
49
-0.4 mA
-0.4 mA
-0.4 mA
-0.4 mA
4 mA
4 mA
4 mA
4 mA
ENBL
CLR
1/
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
2.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
0.4 V
0.4 V
"
2.7 V
0.4 V
"
"
"
"
"
2.7 V
2.7 V
5.5 V
2.7 V
2.7 V
"
"
"
"
"
5.5 V
5.5 V
-18 mA
5.5 V
5.5 V
"
"
"
"
"
-18 mA
-18 mA
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
See footnotes at end of device type 05.
GND
"
"
"
5.0 V
"
"
"
GND
GND
GND
GND
GND
"
"
"
"
"
"
"
"
"
-18 mA
GND
GND
GND
GND
5.0 V
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
-18 mA
"
"
"
"
"
"
"
5.5 V
"
VCC
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
"
"
2.7 V
"
40
IOS
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Measured
terminal
-18 mA
"
5.0 V
"
"
"
"
"
"
"
GND
5.5 V
"
"
"
"
"
"
"
"
Limits
Min
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
A
B
C
DATA IN
ENBL
CLR
Max
2.5
"
"
"
"
"
"
"
4/
"
"
"
"
"
A
B
C
DATA IN
ENBL
CLR
A
B
C
DATA IN
ENBL
CLR
A
B
C
DATA IN
ENBL
CLR
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
VCC
Unit
-15
"
"
"
"
"
"
"
0.4
"
"
"
"
"
"
"
4/
"
"
"
"
V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
20
"
"
"
"
µA
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
"
"
"
-1.5
"
"
"
"
V
"
"
"
"
"
"
-100
"
"
"
"
"
"
"
36
mA
"
"
"
"
"
"
"
"
MIL-M-38510/316E
Subgroup
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Subgroup
Symbol
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
883
method
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Test no.
A
B
C
Q0
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
DATA
IN
ENBL
CLR
VCC
Min
L
"
"
"
"
"
"
"
"
H
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
H
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
H
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
L
"
"
"
"
"
"
"
"
"
"
"
"
"
"
H
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
B
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
"
"
"
"
"
"
"
B
A
A
B
A
A
B
A
A
B
A
A
B
A
A
B
A
A
B
A
A
B
B
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
A
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.0 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
3/
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
2
Same tests, terminal conditions, and limits as for subgroup 1 except TC = +125°C and VI C tests are omitted.
3
Same tests, terminal conditions, and limits as for subgroup 1 except TC = -55°C and VI C tests are omitted.
7 2/
Truth
3014
50
B
B
B
L
L
L
L
GND
"
51
B
"
"
H
"
"
"
"
Tc = 25°C table
tests
"
52
A
"
"
L
"
"
"
"
"
53
A
"
"
"
H
"
"
"
"
54
B
A
"
"
L
"
"
"
"
55
B
"
"
"
"
H
"
"
"
56
A
"
"
"
"
L
"
"
"
57
A
"
"
"
"
"
H
"
"
58
B
B
A
"
"
"
L
"
"
59
B
"
"
"
"
"
"
"
"
60
A
"
"
"
"
"
"
"
"
61
A
"
"
"
"
"
"
"
"
62
B
A
"
"
"
"
"
"
"
63
B
"
"
"
"
"
"
"
"
64
A
"
"
"
"
"
"
"
"
65
"
"
"
"
"
"
"
"
"
66
"
"
"
"
"
"
"
"
"
67
B
"
"
"
"
"
"
"
"
68
A
B
"
"
"
"
"
"
"
69
B
B
"
"
"
"
"
"
"
70
A
A
B
"
"
"
"
"
"
71
B
A
"
"
"
"
"
"
"
72
A
B
"
"
"
"
"
"
"
73
B
"
"
"
"
"
"
"
"
74
"
"
"
H
"
"
"
"
"
75
"
"
"
"
"
"
"
"
"
76
A
"
"
"
"
"
"
"
"
77
"
"
"
"
H
"
"
"
"
78
"
"
"
"
"
"
"
"
"
79
B
A
"
"
"
"
"
"
"
80
"
"
"
"
"
H
"
"
"
81
"
"
"
"
"
"
"
"
"
82
A
"
"
"
"
"
"
"
"
83
"
"
"
"
"
"
H
"
"
84
"
"
"
"
"
"
"
"
"
85
B
B
A
"
"
"
"
"
"
86
"
"
"
"
"
"
"
"
"
87
"
"
"
"
"
"
"
"
"
88
A
"
"
"
"
"
"
"
"
89
"
"
"
"
"
"
"
"
"
90
"
"
"
"
"
"
"
"
"
91
B
A
"
"
"
"
"
"
"
92
"
"
"
"
"
"
"
"
"
93
"
"
"
"
"
"
"
"
"
94
A
"
"
"
"
"
"
"
"
95
A
"
"
"
"
"
"
"
8
Same tests and terminal conditions as for subgroup 7 except TC = +125°C and TC = -55°C.
See footnotes at end of device type 05.
"
Measured
terminal
Limits
Unit
Max
MIL-M-38510/316E
29
Cases
E, F
1
MIL-STD-
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
DATA
IN
4.5 V
ENBL
CLR
VCC
Min
Max
GND
6/
IN
5.0 V
3
23
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
35
"
"
"
"
"
"
"
25
"
"
"
"
"
"
"
32
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
29
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
Subgroup
Symbol
883
method
Test no.
A
B
C
Q0
9
tPHL1
3003
96
GND
GND
GND
OUT
Fig. 5
97
4.5 V
GND
"
"
98
GND
4.5 V
"
Tc = 25°C
tPLH2
tPHL2
30
tPHL3
tPLH4
OUT
"
99
4.5 V
4.5 V
"
"
100
GND
GND
4.5 V
"
"
101
4.5 V
GND
"
"
"
102
GND
4.5 V
"
"
"
103
4.5 V
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
GND
4.5 V
IN
IN
GND
IN
GND
IN
GND
IN
IN
IN
GND
IN
GND
IN
GND
IN
GND
GND
GND
4.5 V
4.5 V
GND
GND
4.5 V
4.5 V
GND
GND
4.5 V
4.5 V
GND
GND
4.5 V
4.5 V
GND
GND
IN
4.5 V
GND
GND
IN
4.5 V
GND
GND
IN
4.5 V
GND
GND
IN
4.5 V
GND
GND
"
"
"
4.5 V
"
"
"
GND
"
"
"
4.5 V
"
"
"
GND
"
"
"
IN
4.5 V
"
"
GND
"
"
"
IN
4.5 V
"
"
GND
"
137
4.5 V
GND
"
"
138
GND
4.5 V
"
"
139
4.5 V
4.5 V
"
"
140
GND
GND
4.5 V
"
"
141
4.5 V
GND
"
"
"
142
GND
4.5 V
"
"
"
143
4.5 V
4.5 V
"
"
See footnotes at end of device type 05.
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
CLR to Q0
CLR to Q1
CLR to Q2
CLR to Q3
CLR to Q4
CLR to Q5
CLR to Q6
CLR to Q7
DI to Q0
DI to Q1
DI to Q2
DI to Q3
DI to Q4
DI to Q5
DI to Q6
DI to Q7
DI to Q0
DI to Q1
DI to Q2
DI to Q3
DI to Q4
DI to Q5
DI to Q6
DI to Q7
A to Q0
A to Q1
B to Q2
A to Q3
C to Q4
A to Q5
B to Q6
A to Q7
A to Q0
A to Q1
B to Q2
A to Q3
C to Q4
A to Q5
B to Q6
A to Q7
ENBL to Q0
ENBL to Q1
ENBL to Q2
ENBL to Q3
ENBL to Q4
ENBL to Q5
ENBL to Q6
ENBL to Q7
Limits
Unit
MIL-M-38510/316E
tPLH3
OUT
Measured
terminal
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
GND
DATA
IN
4.5 V
"
Subgroup
Symbol
883
method
Test no.
A
B
C
Q0
9
tPHL4
3003
144
GND
GND
GND
OUT
Fig 5
145
4.5 V
GND
"
"
146
GND
4.5 V
"
"
147
4.5 V
4.5 V
"
"
148
GND
GND
4.5 V
"
"
149
4.5 V
GND
"
"
"
150
GND
4.5 V
"
"
"
151
4.5 V
4.5 V
"
"
tPLH4
" 5/
152
GND
GND
GND
OUT
tPHL4
"
153
"
"
"
tPLH4
"
154
"
"
"
tPLH4
"
155
4.5 V
"
"
tPHL4
"
156
"
"
tPLH4
"
157
"
tPLH4
"
158
tPHL4
"
tPLH4
Measured
terminal
Limits
Unit
CLR
VCC
Min
Max
IN
GND
5.0 V
3
29
ns
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
IN
IN
4.5 V
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
OUT
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
GND
4.5 V
"
OUT
"
"
"
"
"
"
"
"
159
"
"
"
"
"
"
"
"
"
"
"
"
"
160
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
161
4.5 V
"
"
OUT
"
"
"
"
"
"
"
"
tPHL4
"
162
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
163
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
164
GND
GND
4.5 V
"
OUT
"
"
"
"
"
"
"
tPHL4
"
165
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
166
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
167
4.5 V
"
"
"
OUT
"
"
"
"
"
"
"
tPHL4
"
168
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
169
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
170
GND
4.5 V
"
"
OUT
"
"
"
"
"
"
"
tPHL4
"
171
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
172
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
173
4.5 V
"
"
"
OUT
"
"
"
"
"
"
"
tPHL4
"
174
"
"
"
"
"
"
"
"
"
"
"
"
tPLH4
"
175
"
"
"
"
"
"
"
"
"
"
"
"
tPHL4
"
176
IN
GND
GND
OUT
"
GND
"
"
"
"
"
"
tPLH4
"
177
"
"
"
"
"
4.5 V
"
"
"
"
"
"
tPHL4
"
178
"
"
"
"
"
GND
"
"
"
"
"
"
TC = 25°C
31
See footnotes at end of device type 05.
OUT
OUT
OUT
OUT
OUT
OUT
OUT
ENBL to Q0
ENBL to Q1
ENBL to Q2
ENBL to Q3
ENBL to Q4
ENBL to Q5
ENBL to Q6
ENBL to Q7
ENBL to Q0
ENBL to Q0
ENBL to Q0
ENBL to Q1
ENBL to Q1
ENBL to Q1
ENBL to Q2
ENBL to Q2
ENBL to Q2
ENBL to Q3
ENBL to Q3
ENBL to Q3
ENBL to Q4
ENBL to Q4
ENBL to Q4
ENBL to Q5
ENBL to Q5
ENBL to Q5
ENBL to Q6
ENBL to Q6
ENBL to Q6
ENBL to Q7
ENBL to Q7
ENBL to Q7
ENBL to Q1
ENBL to Q1
ENBL to Q1
MIL-M-38510/316E
ENBL
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
E, F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
Cases
2, X
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Q0
Q1
Q2
Q3
GND
Q4
Q5
Q6
Q7
883
method
Test no.
A
B
C
9
tPHL4
3003
179
GND
IN
GND
OUT
GND
DATA
IN
GND
TC = 25°C
tPLH4
Fig 5
180
"
"
"
"
"
tPHL4
181
"
"
"
"
"
tPHL4
182
"
GND
IN
"
tPLH4
183
"
"
"
tPHL4
184
"
"
"
tPHL4
185
IN
"
GND
OUT
tPLH4
186
"
"
"
tPHL4
187
"
"
"
tPHL4
188
4.5 V
IN
4.5 V
"
tPLH4
189
"
"
"
tPHL4
190
"
"
"
tPHL4
191
"
4.5 V
IN
OUT
tPLH4
192
"
"
"
tPHL4
193
"
"
"
10
TC =125°C
11
CLR
VCC
Min
Max
4.5 V
5.0 V
3
29
ns
4.5 V
"
"
"
"
"
"
GND
"
"
"
"
"
"
OUT
GND
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
OUT
GND
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
"
"
30
46
33
42
42
38
38
"
"
"
"
"
"
"
2/ A = 2.4 V, B = 0.4 V.
3/ H ≥ 1.5 V, L ≤ 1.5 V.
4/ IIL limits are as follows:
Min/max limits (mA)
Circuit B, C
Circuit A
Device 03
Device 05
-.12/-.36
-.16/-.40
Test 21
-.005/-.72
Test 21
-.005/-0.20
5/ See note 6 of figure 5.
6/ Apply
4.5V
0V
4.5 v
Unit
IN
1/ Apply a 3V/0V/3V momentary pulse 500 ns minimum prior to measurements.
IIL1
Limits
ENBL
tPHL1
tPLH2
Same tests and terminal conditions as for subgroup 9, except TC = +125°C and test limits as shown
tPHL2
tPLH3
tPHL3
tPLH4
tPHL4
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
Symbol
Measured
terminal
momentary pulse prior to each test.
ENBL to Q2
ENBL to Q2
ENBL to Q2
ENBL to Q4
ENBL to Q4
ENBL to Q4
ENBL to Q0
ENBL to Q0
ENBL to Q0
ENBL to Q5
ENBL to Q5
ENBL to Q5
ENBL to Q3
ENBL to Q3
ENBL to Q3
MIL-M-38510/316E
Symbol
32
Subgroup
MIL-M-38510/316E
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these
personnel need to contact the responsible packaging activity to ascertain requisite packaging requirements.
Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military
Department of Defense Agency, or within the Military Department's System Command. Packaging data retrieval is
available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM
products, or by contacting the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature which may be helpful, but is not
mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
Complete part number (see 1.2).
c.
Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to contracting activity in addition to
notification to the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883),
corrective action, and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
j.
Requirements for "JAN" marking.
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
33
MIL-M-38510/316E
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ...........................................
IIN ................................................
VIN ...............................................
VSUH ............................................
VSUL ............................................
Ground zero voltage potential.
Current flowing into an input terminal.
Voltage level at an input terminal.
Setup high
Setup low
6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Military device
type
Generic-industry
type
01
02
03
04
05
54LS75
54LS279
54LS259
54LS375
54LS259B
6.8 Manufacturers' designation. Manufacturers' circuits, which form a part of this specification, are designated
with an "X" as shown in table IV herein.
TABLE IV. Manufacturer's designator.
Device
type
01
02
03
04
05
A
Texas
Instruments
X
X
X
X
X
B
Motorola
Inc.
X
X
X
X
CIRCUITS
C
Fairchild Co.
X
X
X
D
Signetics
Corp.
X
X
E
National
Semconductor
X
X
X
X
6.9 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the
previous issue due to the extensiveness of the changes.
34
MIL-M-38510/316E
Custodians:
Army - CR
Navy - EC
Air Force - 11
DLA - CC
Preparing activity:
DLA - CC
(Project 5962-1965)
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
35
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
INSTRUCTIONS
1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision letter should be given.
2. The submitter of this form must complete blocks 4, 5, 6, and 7, and send to preparing activity.
3. The preparing activity must provide a reply within 30 days from receipt of the form.
NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of requirements on current contracts.
Comments submitted on this form do not constitute or imply authorization to waive any portion of the referenced document(s) or to amend
contractual requirements.
I RECOMMEND A CHANGE:
1. DOCUMENT NUMBER
MIL-M-38510/316E
2. DOCUMENT DATE (YYYYMMDD)
2003-07-14
3. DOCUMENT TITLE
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, CASCADABLE LATCHES, MONOLITHIC SILICON
4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)
5. REASON FOR RECOMMENDATION
6. SUBMITTER
a. NAME (Last, First Middle Initial)
c. ADDRESS (Include Zip Code)
8. PREPARING ACTIVITY
a. NAME
Defense Supply Center, Columbus
c. ADDRESS (Include Zip Code)
DSCC-VA
P. O. Box 3990
Columbus, Ohio 43216-5000
DD Form 1426, FEB 1999 (EG)
b. ORGANIZATION
d. TELEPHONE (Include Area Code)
(1) Commercial
(2) DSN
(If applicable)
b. TELEPHONE (Include Area Code
(1) Commercial 614-692-0536
7. DATE SUBMITTED
(YYYYMMDD)
(2) DSN 850-0536
IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT:
Defense Standardization Program Office (DLSC-LM)
8725 John J. Kingman Road, Suite 2533
Fort Belvoir, Virginia 22060-6221
Telephone (703)767-6888 DSN 427-6888
PREVIOUS EDITIONS ARE OBSOLETE.
WHS/DIOR, Feb 99
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