Download datasheet for 5410/BDA by Rochester Electronics

Download datasheet for 5410/BDA by Rochester Electronics
INCH-POUND
MIL-M-38510/1F
16 March 2005
SUPERSEDING
MIL-M-38510/1E
1 June 1982
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, TTL, NAND GATES,
MONOLITHIC SILICON
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, positive NAND logic
gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for
each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have
been superseded by MIL-PRF-38535, (see 6.3).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
Device type
01
02
03
04
05
06
07
08
09
Circuit
Single, 8-input positive NAND gate
Dual, 4-input positive NAND gate
Triple, 3-input positive NAND gate
Quadruple, 2-input positive NAND gate
Hex, 1-input inverter gate
Triple, 3-input positive NAND gate (open collector output)
Quadruple, 2-input positive NAND gate (open collector output)
Hex, 1-input inverter gate (open collector output)
Same as device type 07, except different pin connections
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
A
B
C
D
GDFP5-F14 or CDFP6-F14
GDFP4-F14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
14
14
14
14
Flat
Flat
Dual-in-line
Flat
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to
[email protected] . Since contact information can change, you may want to verify the currency of this address
information using the ASSIST Online database at http://assist.daps.dla.mil .
AMSC N/A
FSC 5962
MIL-M-38510/1F
1.3 Absolute maximum ratings.
Supply voltage range .............................................................................. -0.5 V to +7.0 V
Input voltage range ................................................................................. -1.5 V at -12 mA to +5.5 V
Storage temperature range .................................................................... -65° to +150°C
Maximum power dissipation per gate (PD) 1/.......................................... 40 mW
Lead temperature (soldering, 10 seconds) ............................................. 300°C
Thermal resistance, junction to case (θJC) ............................................. (See MIL-STD-1835)
Junction temperature (TJ) 2/ ................................................................... 175°C
1.4 Recommended operating conditions.
Supply voltage........................................................................................ +4.5 V minimum to +5.5 V maximum
Minimum high level input voltage .......................................................... +2.0 V
Maximum low level input voltage (VIL) ................................................... +0.8 V
Normalized fanout (each output) 3/ ........................................................ 10 maximum
Case operating temperature range ......................................................... -55° to +125°C
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in
screening conditions in accordance with MIL-PRF-38535.
3/ Device will fanout in both high and low levels to the specified number of inputs of the same device type
as that being tested.
2
MIL-M-38510/1F
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification.
This section does not include documents cited in other sections of this specification or recommended for
additional information or as examples. While every effort has been made to ensure the completeness of this
list, document users are cautioned that they must meet all specified requirements of documents cited in
sections 3, 4, or 5 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to
the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
-
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outlines
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be
as specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections and logic diagrams. The terminal connections and logic diagrams shall be as
specified on figure 1.
3.3.2 Truth tables and logic equations. The truth tables and logic equations shall be as specified on figure 2.
3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying activity and the preparing activity upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I,
and apply over the full recommended case operating temperature range, unless otherwise specified.
3
MIL-M-38510/1F
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
Device
-55°C ≤ TC ≤ +125°C
High level output
VOH
voltage
Limits
Unit
types
Min
Max
VCC = 4.5 V, VIN = 0.8 V,
01, 02,
2.4
---
V
IOH = -400 µA 1/
03, 04,
All
0.4
V
All
-1.5
V
VCC = 4.5 V, VIN = 0.8 V,
06, 07
250
µA
VOH = 5.5 V
08, 09
05
Low level output
VOL
voltage
VCC = 4.5 V, IOL = 16 mA,
VIN = 2.0 V for all inputs of gate under
test
Input clamp voltage
VI C
1/
VCC = 4.5 V, IIN = -12 mA
TC = 25°C
Maximum collector
ICEX
cut-off current
High level input
IIH1
VCC = 5.5 V, VIN = 2.4 V
2/
All
40
µA
IIH2
VCC = 5.5 V, VIN = 5.5 V
2/
All
100
µA
IIL
VCC = 5.5 V, VIN = 0.4 V
1/
All
-0.7
-1.6
mA
01, 02,
-20
-55
mA
All
1.65
mA
All
5.0
mA
3
24
ns
3
29
ns
3
27
ns
3
35
ns
current
High level input
current
Low level input
current
Short circuit output
I OS
VCC = 5.5 V
2/ 3/
current
03, 04,
05
High level supply
I CCH
VCC = 5.5 V, VIN = 0 V
2/
I CCL
VCC = 5.5 V, VIN = 5.5 V
tPHL
CL = 50 pF,
01, 02,
RL = 390Ω
03, 04,
current per gate
Low level supply
1/
current per gate
Propagation delay time,
high-to-low level
05
06, 07,
08, 09
Propagation delay time,
low-to-high level
tPLH
CL = 50 pF,
01, 02,
RL = 390Ω
03, 04,
05
06, 07,
08, 09
1/
2/
3/
All unspecified inputs at 5.5 volts.
All unspecified inputs grounded.
Not more than one output should be shorted at a time.
4
MIL-M-38510/1F
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535
test requirements
Class S
devices
1
Class B
devices
1
1*, 2, 3, 9
10, 11
1, 2, 3, 9,
10, 11
1, 2, 3, 9,
10, 11
1, 2, 3, 9,
10, 11
N/A
1*, 2, 3, 9
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Group B electrical test parameters
when using the method 5005 QCI option
Group C end-point electrical
parameters
Additional electrical parameters for
group C periodic inspections
Group D end-point electrical parameters
1, 2, 3
1, 2, 3, 9
N/A
1, 2, 3
10, 11
1, 2, 3
*PDA applies to subgroup 1.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 1 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535
or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall
not affect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior
to qualification and conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, Appendix B.
5
MIL-M-38510/1F
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be
as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be as specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given
are conventional and positive when flowing into the referenced terminal.
6
MIL-M-38510/1F
FIGURE 1. Terminal connections and logic diagrams.
7
MIL-M-38510/1F
FIGURE 1. Terminal connections and logic diagrams - Continued.
8
MIL-M-38510/1F
FIGURE 1. Terminal connections and logic diagrams - Continued.
9
MIL-M-38510/1F
A
H
B
H
Device type 01
Truth table
Input
C
D
E
F
G
H
H
H
H
H
H
H
All other combinations of H and L
at the inputs give H output.
Output
Y
L
Positive logic Y = ABCDEFGH
A
L
H
L
H
L
H
L
H
Device types 03 and 06
Truth table
Input
Output
B
C
Y
L
L
H
L
L
H
H
L
H
H
L
H
L
H
H
L
H
H
H
H
H
H
H
L
Positive logic Y = ABC
A
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
Device type 02
Truth table
Input
B
C
D
L
L
L
L
L
L
H
L
L
H
L
L
L
H
L
L
H
L
H
H
L
H
H
L
L
L
H
L
L
H
H
L
H
H
L
H
L
H
H
L
H
H
H
H
H
H
H
H
Device types 04, 07, and 09
Truth table each gate
Input
Output
A
B
Y
L
L
H
H
L
H
L
H
H
H
H
L
Output
Y
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
L
Positive logic Y = AB
Device types 05 and 08
Truth table each gate
Input
Input
A
Y
L
H
H
L
Positive logic Y = ABCD
Positive logic Y = A
FIGURE 2. Truth tables and logic equations.
10
MIL-M-38510/1F
NOTES:
1. CL = 50 pF minimum, including scope probe, wiring and stray capacitance, without package in test fixture.
2. Voltage measurements are to be made with respect to network ground terminal.
3. All diode are 1N3064 or equivalent.
4. RL = 390 ohm ±5%.
FIGURE 3. Test circuit and switching waveforms.
11
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
12
8
6
F
2.0 V
5.5 V
"
"
"
"
0.8 V
5.5 V
"
GND
GND
"
"
"
"
2.4 V
GND
"
GND
"
"
"
"
5.5 V
GND
"
5.5 V
"
"
"
"
0.4 V
5.5 V
"
5.5 V
GND
9
11
G
2.0 V
5.5 V
"
"
"
"
"
0.8 V
5.5 V
GND
GND
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
10
12
H
2.0 V
5.5 V
"
"
"
"
"
"
0.8 V
GND
GND
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
0.4 V
5.5 V
GND
12
8
Y
16mA
-.4mA
"
"
"
"
"
"
"
GND
-12 mA
11
7
GND
GND
GND
"
"
"
"
"
"
"
GND
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
GND
GND
"
"
"
"
"
"
"
2.4 V
"
2.4 V
"
GND
"
GND
"
OUT
"
OUT
"
-12 mA
-12 mA
2.4 V
"
2.4 V
"
2.4 V
"
2.4 V
"
13
9
NC
14
10
NC
Measured
terminal
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
A
B
C
D
E
F
G
H
VCC
VCC
A
B
C
D
E
F
G
H
A to Y
A to Y
A to Y
A to Y
Limits
Min
Max
0.4
2.4
"
"
"
"
"
"
"
-20
-55
40
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
5.0
1.65
-1.5
"
"
"
"
"
"
"
3
3
3
3
20
25
24
27
Unit
V
V
"
"
"
"
"
"
"
mA
µA
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
mA
mA
V
"
"
"
"
"
"
"
ns
ns
ns
ns
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
7
883
Case C
13
1
2
14
3
4
5
method
Test no.
NC
A
B
VCC
C
D
E
1
VOL
3007
1
2.0 V
2.0 V
4.5 V
2.0 V
2.0 V
2.0 V
VOH
3006
2
0.8 V
5.5 V
4.5 V
5.5 V
5.5 V
5.5 V
Tc = 25°C
3
5.5 V
0.8 V
"
"
"
"
4
"
5.5 V
"
0.8 V
"
"
5
"
"
"
5.5 V
0.8 V
"
6
"
"
"
"
5.5 V
0.8 V
7
"
"
"
"
"
5.5 V
8
"
"
"
"
"
"
9
"
"
"
"
"
"
IOS
3011
10
GND
GND
5.5 V
GND
GND
GND
IIH1
3010
11
2.4 V
GND
5.5 V
GND
GND
GND
12
GND
2.4 V
"
"
"
"
13
"
GND
"
2.4 V
"
"
14
"
"
"
GND
2.4 V
"
15
"
"
"
"
GND
2.4 V
16
"
"
"
"
"
GND
17
"
"
"
"
"
"
18
"
"
"
"
"
"
IIH2
3010
19
5.5 V
GND
5.5 V
GND
GND
GND
20
GND
5.5 V
"
"
"
"
21
"
GND
"
5.5 V
"
"
22
"
"
"
GND
5.5 V
"
23
"
"
"
"
GND
5.5 V
24
"
"
"
"
"
GND
25
"
"
"
"
"
"
26
"
"
"
"
"
"
IIL
3009
27
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
28
5.5 V
0.4 V
"
"
"
"
29
"
5.5 V
"
0.4 V
"
"
30
"
"
"
5.5 V
0.4 V
"
31
"
"
"
"
5.5 V
0.4 V
32
"
"
"
"
"
5.5 V
33
"
"
"
"
"
"
34
"
"
"
"
"
"
ICCL
3005
35
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
36
GND
GND
5.5 V
GND
GND
GND
VI C
37
-12 mA
4.5 V
38
-12 mA
"
39
"
-12 mA
40
"
-12 mA
41
"
-12 mA
42
"
43
"
44
"
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
9
tPHL
3003
45
IN
2.4 V
5.0 V
2.4 V
2.4 V
2.4 V
tPLH
(Fig. 3)
46
"
"
"
"
"
"
Tc = 25°C
10
tPHL
3003
47
IN
2.4 V
5.0 V
2.4 V
2.4 V
2.4 V
tPLH
(Fig. 3)
48
"
"
"
"
"
"
Tc = 125°C
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
13
8
12
2C
5.5 V
2.0 V
5.5 V
"
"
"
"
"
0.8 V
5.5 V
9
13
2D
5.5 V
2.0 V
5.5 V
"
"
"
"
"
"
0.8 V
GND
GND
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
GND
GND
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
0.4 V
5.5 V
GND
10
8
2Y
16 mA
-.4 mA
"
"
"
-12 mA
2.4 V
12
2
1B
2.0 V
5.5 V
5.5 V
0.8 V
5.5 V
"
"
"
"
"
GND
13
4
1C
2.0 V
5.5 V
5.5 V
"
0.8 V
5.5 V
"
"
"
"
GND
14
5
1D
2.0 V
5.5 V
5.5 V
"
"
0.8 V
5.5 V
"
"
"
GND
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
GND
GND
"
"
"
"
"
"
"
GND
2.4 V
GND
"
"
"
"
"
GND
5.5 V
GND
"
"
"
"
"
5.5 V
0.4 V
5.5 V
"
"
"
"
"
5.5 V
GND
GND
"
2.4 V
GND
"
"
"
"
GND
"
5.5 V
GND
"
"
"
"
5.5 V
"
0.4 V
5.5 V
"
"
"
"
5.5 V
GND
GND
"
"
2.4 V
GND
"
"
"
GND
"
"
5.5 V
GND
"
"
"
5.5 V
"
"
0.4 V
5.5 V
"
"
"
5.5 V
GND
GND
-12 mA
2.4 V
11
7
GND
GND
"
GND
"
"
"
"
"
"
"
GND
OUT
2.4 V
2.4 V
OUT
2.4 V
2.4 V
OUT
2.4 V
2.4 V
OUT
GND
"
GND
"
GND
"
GND
"
-12 mA
-12 mA
-12 mA
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
Measured
terminal
1Y
2Y
1Y
1Y
1Y
1Y
2Y
2Y
2Y
2Y
1Y
2Y
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
1A
1B
1C
1D
2A
2B
2C
2D
VCC
VCC
1A
1B
1C
1D
2A
2B
2C
2D
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
1A to 1Y
2A to 2Y
Limits
Min
Max
0.4
"
2.4
"
"
"
"
"
"
"
-20
-55
"
"
40
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
10
3.3
-1.5
"
"
"
"
"
"
"
3
"
3
"
3
"
3
"
20
"
25
"
24
"
27
"
Unit
V
"
V
"
"
"
"
"
"
"
mA
"
µA
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
mA
mA
V
"
"
"
"
"
"
"
ns
"
ns
"
ns
"
ns
"
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
7
883
Case C
1
6
3
14
11
9
10
method
Test no.
1A
1Y
NC
VCC
NC
2A
2B
1
VOL
3007
1
2.0 V
16 mA
4.5 V
5.5 V
5.5 V
2
5.5 V
"
2.0 V
2.0 V
Tc = 25°C
VOH
3006
3
0.8 V
-.4 mA
4.5 V
5.5 V
5.5 V
4
5.5 V
"
"
"
"
5
"
"
"
"
"
6
"
"
"
"
"
7
"
"
0.8 V
"
8
"
"
5.5 V
0.8 V
9
"
"
"
5.5 V
10
"
"
"
"
IOS
3011
11
GND
GND
5.5 V
12
"
GND
GND
IIH1
3010
13
2.4 V
5.5 V
GND
GND
14
GND
"
"
"
15
"
"
"
"
16
"
"
"
"
17
"
"
2.4 V
"
18
"
"
GND
2.4 V
19
"
"
"
GND
20
"
"
"
"
IIH2
3010
21
5.5 V
5.5 V
GND
GND
22
GND
"
"
"
23
"
"
"
"
24
"
"
"
"
25
"
"
5.5 V
"
26
"
"
GND
5.5 V
27
"
"
"
GND
28
"
"
"
"
IIL
3009
29
0.4 V
5.5 V
5.5 V
5.5 V
30
5.5 V
"
"
"
31
"
"
"
"
32
"
"
"
"
33
"
"
0.4 V
"
34
"
"
5.5 V
0.4 V
35
"
"
"
5.5 V
36
"
"
"
"
ICCL
3005
37
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
38
GND
5.5 V
GND
GND
VI C
39
-12 mA
4.5 V
40
"
41
"
42
"
43
"
-12 mA
44
"
-12 mA
45
"
46
"
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
9
tPHL
3003
47
IN
OUT
5.0 V
tPHL
(Fig. 3)
48
"
IN
2.4 V
Tc = 25°C
tPLH
3003
49
IN
OUT
5.0 V
tPLH
(Fig. 3)
50
"
IN
2.4 V
10
tPHL
3003
51
IN
OUT
5.0 V
tPHL
(Fig. 3)
52
"
IN
2.4 V
Tc = 125°C
tPLH
3003
53
IN
OUT
5.0 V
tPLH
(Fig. 3)
54
"
IN
2.4 V
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
8
5
2C
5.5 V
2.0 V
5.5 V
5.5 V
"
"
"
"
0.8 V
5.5 V
"
"
14
9
9
3A
5.5 V
"
2.0 V
5.5 V
"
"
"
"
"
0.8 V
5.5 V
"
10
10
3B
5.5 V
"
2.0 V
5.5 V
"
"
"
"
"
"
0.8 V
5.5 V
GND
GND
"
"
"
"
"
2.4 V
GND
"
GND
"
"
"
"
"
5.5 V
GND
"
5.5 V
"
"
"
"
"
0.4 V
5.5 V
"
GND
5.5 V
GND
GND
"
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
"
0.4 V
5.5 V
GND
5.5 V
GND
GND
"
"
"
"
2.4 V
GND
"
"
GND
"
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
"
0.4 V
5.5 V
"
"
GND
5.5 V
-12 mA
-12 mA
-12 mA
11
7
GND
GND
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
GND
GND
GND
"
"
"
"
"
"
"
"
12
11
3C
5.5 V
"
2.0 V
5.5 V
"
"
"
"
"
"
"
0.8 V
GND
GND
"
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
"
0.4 V
GND
5.5 V
13
8
3Y
16 mA
-.4 mA
"
"
14
13
1C
2.0 V
5.5 V
"
5.5 V
"
0.8 V
5.5 V
"
"
"
"
"
GND
GND
GND
"
2.4 V
GND
"
"
"
"
"
GND
"
5.5 V
GND
"
"
"
"
"
5.5 V
"
0.4 V
5.5 V
"
"
"
"
"
GND
5.5 V
-12 mA
-12 mA
Measured
terminal
1Y
2Y
3Y
1Y
1Y
1Y
2Y
2Y
2Y
3Y
3Y
3Y
1Y
2Y
3Y
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
VCC
VCC
1A
1B
1C
2A
2B
2C
3A
3B
3C
Limits
Min
Max
0.4
"
"
2.4
"
"
"
"
"
"
"
"
-20
-55
"
"
"
"
40
"
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
4.95
15
-1.5
"
"
"
"
"
"
"
"
Unit
V
"
"
V
"
"
"
"
"
"
"
"
mA
"
"
µA
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
mA
mA
V
"
"
"
"
"
"
"
"
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
7
883
Case C
1
2
12
14
6
3
4
method
Test no.
1A
1B
1Y
VCC
2Y
2A
2B
1
VOL
3007
1
2.0 V
2.0 V
16 mA
4.5 V
5.5 V
5.5 V
2
5.5 V
5.5 V
"
16 mA
2.0 V
2.0 V
Tc = 25°C
3
"
"
"
5.5 V
5.5 V
VOH
3006
4
0.8 V
5.5 V
-.4 mA
4.5 V
5.5 V
5.5 V
5
5.5 V
0.8 V
"
"
"
"
6
"
5.5 V
"
"
"
"
7
"
"
"
-.4 mA
0.8 V
"
8
"
"
"
"
5.5 V
0.8 V
9
"
"
"
"
"
5.5 V
10
"
"
"
"
"
11
"
"
"
"
"
12
"
"
"
"
"
IOS
3011
13
GND
GND
GND
5.5 V
14
"
GND
GND
GND
15
"
IIH1
3010
16
2.4 V
GND
5.5 V
GND
GND
17
GND
2.4 V
"
"
"
18
"
GND
"
"
"
19
"
"
"
2.4 V
"
20
"
"
"
GND
2.4 V
21
"
"
"
"
GND
22
"
"
"
"
"
23
"
"
"
"
"
24
"
"
"
"
"
IIH2
3010
25
5.5 V
GND
5.5 V
GND
GND
26
GND
5.5 V
"
"
"
27
"
GND
"
"
"
28
"
"
"
5.5 V
"
29
"
"
"
GND
5.5 V
30
"
"
"
"
GND
31
"
"
"
"
"
32
"
"
"
"
"
33
"
"
"
"
"
IIL
3009
34
0.4 V
5.5 V
"
5.5 V
5.5 V
35
5.5 V
0.4 V
"
"
"
36
"
5.5 V
"
"
"
37
"
"
"
0.4 V
"
38
"
"
"
5.5 V
0.4 V
39
"
"
"
"
5.5 V
40
"
"
"
"
"
41
"
"
"
"
"
42
"
"
"
"
"
ICCH
3005
43
GND
GND
5.5 V
GND
GND
ICCL
3005
44
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
VI C
45
-12 mA
4.5 V
46
-12mA
"
47
"
48
"
-12 mA
49
"
-12 mA
50
"
51
"
52
"
53
"
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
Subgroup
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D
1
2
3
4
883
Case C
1
2
12
14
method
Test no.
1A
1B
1Y
VCC
9
tPHL
3003
54
IN
2.4 V
OUT
5.0 V
(Fig. 3)
55
"
Tc = 25°C
56
"
tPLH
3003
57
IN
2.4 V
OUT
5.0 V
(Fig. 3)
58
"
59
"
10
tPHL
3003
60
IN
2.4 V
OUT
5.0 V
(Fig. 3)
61
"
Tc = 125°C
62
"
tPLH
3003
63
IN
2.4 V
OUT
5.0 V
(Fig. 3)
64
"
65
"
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
Symbol
5
6
2Y
6
3
2A
7
4
2B
8
5
2C
OUT
IN
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
OUT
IN
2.4 V
9
9
3A
10
10
3B
IN
2.4 V
IN
2.4 V
IN
2.4 V
IN
2.4 V
2.4 V
11
7
GND
GND
"
"
GND
"
"
GND
"
"
GND
"
"
12
11
3C
13
8
3Y
2.4 V
OUT
14
13
1C
2.4 V
2.4 V
2.4 V
OUT
2.4 V
OUT
2.4 V
OUT
2.4 V
2.4 V
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
Limits
Min
Max
3
20
"
"
"
"
3
25
"
"
"
"
3
24
"
"
"
"
3
27
"
"
"
"
Unit
ns
"
"
ns
"
"
ns
"
"
ns
"
"
MIL-M-38510/1F
15
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
8
8
3Y
16 mA
-.4 mA
"
GND
16
9
9
3A
5.5 V
"
2.0 V
5.5 V
5.5 V
"
"
"
0.8 V
5.5 V
"
"
10
10
3B
5.5 V
"
2.0 V
5.5 V
5.5 V
"
"
"
"
0.8 V
5.5 V
"
GND
GND
GND
"
"
"
2.4 V
GND
"
"
GND
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
0.4 V
5.5 V
"
"
GND
5.5 V
GND
"
"
"
"
2.4 V
GND
"
GND
"
"
"
"
5.5 V
GND
"
5.5 V
"
"
"
"
0.4 V
5.5 V
"
GND
5.5 V
-12 mA
-12 mA
11
7
GND
GND
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
GND
GND
"
"
"
"
"
"
"
12
12
4A
5.5 V
"
"
2.0 V
5.5 V
"
"
"
"
"
0.8 V
5.5 V
13
13
4B
5.5 V
"
"
2.0 V
5.5 V
"
"
"
"
"
"
0.8 V
GND
GND
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
GND
5.5 V
GND
GND
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
0.4 V
GND
5.5 V
-12 mA
-12 mA
14
11
4Y
16 mA
-.4 mA
"
GND
Measured
terminal
1Y
2Y
3Y
4Y
1Y
1Y
2Y
2Y
3Y
3Y
4Y
4Y
1Y
2Y
3Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
VCC
VCC
1A
1B
2A
2B
3A
3B
4A
4B
Limits
Min
Max
0.4
"
"
"
2.4
"
"
"
"
"
"
"
-20
-55
"
"
"
"
"
"
40
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
6.6
20
-1.5
"
"
"
"
"
"
"
Unit
V
"
"
"
V
"
"
"
"
"
"
"
mA
"
"
"
µA
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
mA
mA
V
"
"
"
"
"
"
"
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
7
883
Case C
1
2
3
14
6
4
5
method
Test no.
1A
1B
1Y
VCC
2Y
2A
2B
1
VOL
3007
1
2.0 V
2.0 V
16 mA
4.5 V
5.5 V
5.5 V
2
5.5 V
5.5 V
"
16 mA
2.0 V
2.0 V
Tc = 25°C
3
"
"
"
5.5 V
5.5 V
4
"
"
"
"
"
VOH
3006
5
0.8 V
5.5 V
-.4 mA
4.5 V
5.5 V
5.5 V
6
5.5 V
0.8 V
"
"
"
"
7
"
5.5 V
"
-.4 mA
0.8 V
"
8
"
"
"
"
5.5 V
0.8 V
9
"
"
"
"
5.5 V
10
"
"
"
"
"
11
"
"
"
"
"
12
"
"
"
"
"
IOS
3011
13
GND
GND
GND
5.5 V
14
"
GND
GND
GND
15
"
16
"
IIH1
3010
17
2.4 V
GND
5.5 V
GND
GND
18
GND
2.4 V
"
"
"
19
"
GND
"
2.4 V
"
20
"
"
"
GND
2.4 V
21
"
"
"
"
GND
22
"
"
"
"
"
23
"
"
"
"
"
24
"
"
"
"
"
IIH2
3010
25
5.5 V
GND
5.5 V
GND
GND
26
GND
5.5 V
"
"
"
27
"
GND
"
5.5 V
"
28
"
"
"
GND
5.5 V
29
"
"
"
"
GND
30
"
"
"
"
"
31
"
"
"
"
"
32
"
"
"
"
"
IIL
3009
33
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
34
5.5 V
0.4 V
"
"
"
35
"
5.5 V
"
0.4 V
"
36
"
"
"
5.5 V
0.4 V
37
"
"
"
"
5.5 V
38
"
"
"
"
"
39
"
"
"
"
"
40
"
"
"
"
"
ICCH
3005
41
GND
GND
5.5 V
GND
GND
ICCL
3005
42
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
VI C
43
-12 mA
4.5 V
44
-12mA
"
45
"
-12 mA
46
"
-12 mA
47
"
48
"
49
"
50
"
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
Subgroup
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D
1
2
3
4
883
Case C
1
2
12
14
method
Test no.
1A
1B
1Y
VCC
9
tPHL
3003
51
IN
2.4 V
OUT
5.0 V
(Fig. 3)
52
"
Tc = 25°C
53
"
54
"
tPLH
3003
55
IN
2.4 V
OUT
5.0 V
(Fig. 3)
56
"
57
"
58
"
10
tPHL
3003
59
IN
2.4 V
OUT
5.0 V
(Fig. 3)
60
"
Tc = 125°C
61
"
62
"
tPLH
3003
63
IN
2.4 V
OUT
5.0 V
(Fig. 3)
64
"
65
"
66
"
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
Symbol
5
6
2Y
6
3
2A
7
4
2B
OUT
IN
2.4 V
OUT
IN
8
5
3Y
9
9
3A
10
10
3B
OUT
IN
2.4 V
2.4 V
OUT
OUT
IN
IN
2.4 V
2.4 V
OUT
OUT
IN
IN
2.4 V
2.4 V
OUT
IN
2.4 V
11
7
GND
GND
"
"
"
GND
"
"
"
GND
"
"
"
GND
"
"
"
12
11
4A
13
8
4B
14
13
4Y
IN
2.4 V
OUT
IN
2.4 V
OUT
IN
2.4 V
OUT
IN
2.4 V
OUT
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
Limits
Min
Max
3
20
"
"
"
"
"
"
3
25
"
"
"
"
"
"
3
24
"
"
"
"
"
"
3
27
"
"
"
"
"
"
Unit
ns
"
"
"
ns
"
"
"
ns
"
"
"
ns
"
"
"
MIL-M-38510/1F
17
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
8
8
4Y
16mA
-.4 mA
9
11
5A
5.5 V
"
"
"
2.0 V
5.5 V
5.5 V
"
"
"
0.8 V
5.5 V
10
10
5Y
16mA
-.4 mA
GND
GND
18
GND
"
"
"
2.4 V
GND
GND
"
"
"
5.5 V
GND
5.5 V
"
"
"
0.4 V
5.5 V
5.5 V
GND
-12 mA
GND
11
7
GND
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
GND
GND
"
"
"
"
"
12
12
6Y
16mA
-.4 mA
13
13
6Y
5.5 V
"
"
"
"
2.0 V
5.5 V
"
"
"
"
0.8 V
14
2
6A
16mA
-.4mA
GND
GND
GND
GND
"
"
"
"
2.4 V
GND
"
"
"
"
5.5 V
5.5 V
"
"
"
"
0.4 V
5.5 V
GND
-12 mA
Measured
terminal
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
VCC
VCC
1A
2A
3A
4A
5A
6A
Limits
Min
Max
0.4
"
"
"
"
"
2.4
"
"
"
"
"
-20
-55
"
"
"
"
"
"
"
"
"
"
40
"
"
"
"
"
100
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
30
9.9
-1.5
"
"
"
"
"
Unit
V
"
"
"
"
"
V
"
"
"
"
"
mA
"
"
"
"
"
µA
"
"
"
"
"
µA
"
"
"
"
"
mA
"
"
"
"
"
mA
mA
V
"
"
"
"
"
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
7
883
Case C
11
4
3
14
5
6
9
method
Test no.
1A
2Y
2A
VCC
3A
3Y
4A
1
VOL
3007
1
2.0 V
5.5 V
4.5 V
5.5 V
5.5 V
2
5.5 V
16 mA
2.0 V
"
"
"
Tc = 25°C
3
"
5.5 V
"
2.0 V
16mA
"
4
"
"
"
5.5 V
2.0 V
5
"
"
"
"
5.5 V
6
"
"
"
"
"
VOH
3006
7
0.8 V
5.5 V
4.5 V
5.5 V
5.5 V
8
5.5 V
-.4 mA
0.8 V
"
"
"
9
"
5.5 V
"
0.8 V
-.4 mA
"
10
"
"
"
5.5 V
0.8 V
11
"
"
"
"
5.5 V
12
"
"
"
"
"
IOS
3011
13
GND
5.5 V
14
GND
GND
"
15
"
GND
GND
16
"
GND
17
"
18
"
IIH1
3010
19
2.4 V
GND
5.5 V
GND
GND
20
GND
2.4 V
"
"
"
21
"
GND
"
2.4 V
"
22
"
"
"
GND
2.4
23
"
"
"
"
GND
24
"
"
"
"
"
IIH2
3010
25
5.5 V
GND
5.5 V
GND
GND
26
GND
5.5 V
"
"
"
27
"
GND
"
5.5 V
"
28
"
"
"
GND
5.5 V
29
"
"
"
"
GND
30
"
"
"
"
"
IIL
3009
31
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
32
5.5 V
0.4 V
"
"
"
33
"
5.5 V
"
0.4 V
"
34
"
"
"
5.5 V
0.4 V
35
"
"
"
"
5.5 V
36
"
"
"
"
"
ICCL
3005
37
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
38
GND
GND
5.5 V
GND
GND
VI C
39
-12 mA
4.5 V
40
-12 mA
"
41
"
-12 mA
42
"
-12 mA
43
"
44
"
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
Subgroup
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D
1
2
3
4
883
Case C
1
2
12
14
method
Test no.
1A
1B
1Y
VCC
9
tPHL
3003
45
IN
5.0 V
(Fig. 3)
46
OUT
IN
"
Tc = 25°C
47
"
48
"
49
"
50
"
tPLH
3003
51
IN
5.0 V
(Fig. 3)
52
OUT
IN
"
53
"
54
"
55
"
56
"
10
tPHL
3003
57
IN
5.0 V
(Fig. 3)
58
OUT
IN
"
Tc = 125°C
59
"
60
"
61
"
62
"
tPLH
3003
63
IN
5.0 V
(Fig. 3)
64
OUT
IN
"
65
"
66
"
67
"
68
"
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
Symbol
5
6
2Y
6
3
2A
IN
OUT
7
4
2B
IN
8
5
3Y
9
9
3A
OUT
IN
IN
OUT
IN
OUT
OUT
IN
OUT
IN
IN
OUT
OUT
IN
IN
10
10
3B
OUT
OUT
IN
OUT
IN
OUT
11
7
GND
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
12
11
4A
OUT
13
8
4B
14
13
4Y
OUT
IN
OUT
OUT
IN
OUT
OUT
IN
OUT
OUT
IN
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
Limits
Min
Max
3
20
"
"
"
"
"
"
"
"
"
"
3
25
"
"
"
"
"
"
"
"
"
"
3
24
"
"
"
"
"
"
"
"
"
"
3
27
"
"
"
"
"
"
"
"
"
"
Unit
ns
"
"
"
"
"
ns
"
"
"
"
"
ns
"
"
"
"
"
ns
"
"
"
"
"
MIL-M-38510/1F
19
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
5
2C
5.5 V
2.0 V
5.5 V
5.5 V
"
"
"
"
0.8 V
5.5 V
"
"
9
3A
5.5 V
"
2.0 V
5.5 V
"
"
"
"
"
0.8 V
5.5 V
"
10
3B
5.5 V
"
2.0 V
5.5 V
"
"
"
"
"
"
0.8 V
5.5 V
-12 mA
-12 mA
-12 mA
20
GND
"
"
"
"
2.4 V
GND
"
"
GND
"
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
"
0.4 V
5.5 V
"
"
5.5 V
GND
GND
"
"
"
"
"
2.4 V
GND
"
GND
"
"
"
"
"
5.5 V
GND
"
5.5 V
"
"
"
"
"
0.4 V
5.5 V
"
5.5 V
GND
GND
"
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
7
GND
GND
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
GND
GND
11
3C
5.5 V
"
2.0 V
5.5 V
"
"
"
"
"
"
"
0.8 V
8
3Y
16 mA
5.5 V
"
"
13
1C
2.0 V
5.5 V
"
5.5 V
"
0.8 V
5.5 V
"
"
"
"
"
-12 mA
-12 mA
GND
"
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
"
0.4 V
5.5 V
GND
GND
"
2.4 V
GND
"
"
"
"
"
GND
"
5.5 V
GND
"
"
"
"
"
5.5 V
"
0.4 V
5.5 V
"
"
"
"
"
5.5 V
GND
Measured
terminal
1Y
2Y
3Y
1Y
1Y
1Y
2Y
2Y
2Y
3Y
3Y
3Y
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
1A
1B
1C
2A
2B
2C
3A
3B
3C
VCC
VCC
Limits
Min
Max
0.4
"
"
250
"
"
"
"
"
"
"
"
-1.5
"
"
"
"
"
"
"
"
40
"
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
"
15
4.95
Unit
V
"
"
µA
"
"
"
"
"
"
"
"
V
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
"
mA
mA
MIL-M-38510/1F
MIL-STD- Cases A, B,
883
C, and D
1
2
12
14
6
3
4
method
Test no.
1A
1B
1Y
VCC
2Y
2A
2B
1
VOL
3007
1
2.0 V
2.0 V
16 mA
4.5 V
5.5 V
5.5 V
2
5.5 V
5.5 V
"
16 mA
2.0 V
2.0 V
Tc = 25°C
3
"
"
"
5.5 V
5.5 V
ICEX
4
0.8 V
5.5 V
5.5 V
4.5 V
5.5 V
5.5 V
5
5.5 V
0.8 V
"
"
"
"
6
"
5.5 V
"
"
"
"
7
"
"
"
5.5 V
0.8 V
"
8
"
"
"
"
5.5 V
0.8 V
9
"
"
"
"
"
5.5 V
10
"
"
"
"
"
11
"
"
"
"
"
12
"
"
"
"
"
VI C
13
-12 mA
4.5 V
14
-12 mA
"
15
"
16
"
-12 mA
17
"
-12 mA
18
"
19
"
20
"
21
"
IIH1
3010
22
2.4 V
GND
5.5 V
GND
GND
23
GND
2.4 V
"
"
"
24
"
GND
"
"
"
20
"
"
"
2.4 V
"
26
"
"
"
GND
2.4 V
27
"
"
"
"
GND
28
"
"
"
"
"
29
"
"
"
"
"
30
"
"
"
"
"
IIH2
3010
31
5.5 V
GND
5.5 V
GND
GND
32
GND
5.5 V
"
"
"
33
"
GND
"
"
"
34
"
"
"
5.5 V
"
35
"
"
"
GND
5.5 V
36
"
"
"
"
GND
37
"
"
"
"
"
38
"
"
"
"
"
39
"
"
"
"
"
II L
3009
40
0.4 V
5.5 V
5.5 V
5.5 V
5.5 V
41
5.5 V
0.4 V
"
"
"
42
"
5.5 V
"
"
"
43
"
"
"
0.4 V
"
44
"
"
"
5.5 V
0.4 V
45
"
"
"
"
5.5 V
46
"
"
"
"
"
47
"
"
"
"
"
48
"
"
"
"
"
ICCL
3005
49
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
50
GND
GND
5.5 V
GND
GND
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
Subgroup
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B,
883
C, and D
1
2
12
14
method
Test no.
1A
1B
1Y
VCC
9
tPHL
3003
51
IN
2.4 V
OUT
5.0 V
(Fig. 3)
52
"
Tc = 25°C
53
"
tPLH
3003
54
IN
2.4 V
OUT
5.0 V
(Fig. 3)
55
"
56
"
10
tPHL
3003
57
IN
2.4 V
OUT
5.0 V
(Fig. 3)
58
"
Tc = 125°C
59
"
tPLH
3003
60
IN
2.4 V
OUT
5.0 V
(Fig. 3)
61
"
62
"
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
Symbol
6
2Y
3
2A
4
2B
5
2C
OUT
IN
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
OUT
IN
2.4 V
2.4 V
OUT
IN
2.4 V
9
3A
10
3B
IN
2.4 V
IN
2.4 V
IN
2.4 V
IN
2.4 V
2.4 V
7
GND
GND
"
"
GND
"
"
GND
"
"
GND
"
"
11
3C
8
3Y
2.4 V
OUT
13
1C
2.4 V
2.4 V
2.4 V
OUT
2.4 V
OUT
2.4 V
OUT
2.4 V
2.4 V
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
1A to 1Y
2A to 2Y
3A to 3Y
Limits
Min
Max
3
23
"
"
"
"
3
28
"
"
"
"
3
29
"
"
"
"
3
35
"
"
"
"
Unit
ns
"
"
ns
"
"
ns
"
"
ns
"
"
MIL-M-38510/1F
21
TABLE III. Group A inspection for device type 07.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
22
7
6
2B
5.5 V
2.0 V
5.5 V
"
5.5 V
"
4.5 V
0.8 V
5.5 V
"
"
"
GND
"
"
2.4 V
GND
"
"
"
GND
"
"
5.5 V
GND
"
"
"
5.5 V
"
"
0.4 V
5.5 V
"
"
"
5.5 V
GND
8
10
3Y
16 mA
5.5 V
"
9
8
3A
5.5 V
"
2.0 V
5.5 V
5.5 V
"
"
"
0.8 V
4.5 V
5.5 V
"
GND
"
"
"
2.4 V
GND
"
"
GND
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
0.4 V
5.5 V
"
"
5.5 V
GND
10
9
3B
5.5 V
"
2.0 V
5.5 V
5.5 V
"
"
"
4.5 V
0.8 V
5.5 V
"
GND
"
"
"
"
2.4 V
GND
"
GND
"
"
"
"
5.5 V
GND
"
5.5 V
"
"
"
"
0.4 V
5.5 V
"
5.5 V
GND
-12mA
-12mA
-12mA
11
7
GND
GND
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
GND
GND
"
"
"
"
"
"
"
12
11
4A
5.5 V
"
"
2.0 V
5.5 V
"
"
"
"
"
0.8 V
4.5 V
GND
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
13
12
4B
5.5 V
"
"
2.0 V
5.5 V
"
"
"
"
"
4.5 V
0.8 V
GND
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
0.4 V
5.5 V
GND
-12mA
-12mA
14
13
4Y
16 mA
5.5 V
"
Measured
terminal
1Y
2Y
3Y
4Y
1Y
1Y
2Y
2Y
3Y
3Y
4Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
VCC
VCC
1A
1B
2A
2B
3A
3B
4A
4B
Limits
Min
Max
0.4
"
"
"
250
"
"
"
"
"
"
"
40
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
20
6.6
-1.5
"
"
"
"
"
"
"
Unit
V
"
"
"
µA
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
mA
mA
V
"
"
"
"
"
"
"
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
883
Case C
2
3
1
14
4
5
method
Test no.
1A
1B
1Y
VCC
2Y
2A
1
VOL
3007
1
2.0 V
2.0 V
16 mA
4.5 V
5.5 V
2
5.5 V
5.5 V
"
16 mA
2.0 V
Tc = 25°C
3
"
"
"
5.5 V
4
"
"
"
"
ICEX
5
0.8 V
4.5 V
5.5 V
4.5 V
5.5 V
6
4.5 V
0.8 V
"
"
"
7
5.5 V
5.5 V
"
5.5 V
0.8 V
8
"
"
"
"
4.5 V
9
"
"
"
5.5 V
10
"
"
"
"
11
"
"
"
"
12
"
"
"
"
IIH1
3010
13
2.4 V
GND
5.5 V
GND
14
GND
2.4 V
"
"
15
"
GND
"
2.4 V
16
"
"
"
GND
17
"
"
"
"
18
"
"
"
"
19
"
"
"
"
20
"
"
"
"
IIH2
3010
21
5.5 V
GND
5.5 V
GND
22
GND
5.5 V
"
"
23
"
GND
"
5.5 V
24
"
"
"
GND
25
"
"
"
"
26
"
"
"
"
27
"
"
"
"
28
"
"
"
"
II L
3009
29
0.4 V
5.5 V
5.5 V
5.5 V
30
5.5 V
0.4 V
"
"
31
"
5.5 V
"
0.4 V
32
"
"
"
5.5 V
33
"
"
"
"
34
"
"
"
"
35
"
"
"
"
36
"
"
"
"
ICCL
3005
37
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
38
GND
GND
5.5 V
GND
VI C
39
-12mA
4.5 V
40
-12mA
"
41
"
-12mA
42
"
43
"
44
"
45
"
46
"
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
Subgroup
TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D
1
2
3
4
883
Case C
2
3
1
14
method
Test no.
1A
1B
1Y
VCC
9
tPHL
3003
47
IN
2.4 V
OUT
5.0 V
(Fig. 3)
48
"
Tc = 25°C
49
"
50
tPLH
3003
51
IN
2.4 V
OUT
5.0 V
(Fig. 3)
52
"
53
"
54
10
tPHL
3003
55
IN
2.4 V
OUT
5.0 V
(Fig. 3)
56
"
Tc = 125°C
57
"
58
tPLH
3003
59
IN
2.4 V
OUT
5.0 V
(Fig. 3)
60
"
61
"
62
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
Symbol
5
4
2Y
6
5
2A
7
6
2B
OUT
IN
2.4 V
8
10
3Y
9
8
3A
10
9
3B
OUT
IN
2.4 V
11
7
GND
GND
"
"
2.4 V
GND
"
"
2.4 V
GND
"
"
2.4 V
GND
"
"
12
11
4A
IN
OUT
IN
2.4 V
OUT
IN
IN
OUT
IN
2.4 V
OUT
IN
IN
OUT
IN
2.4 V
OUT
IN
IN
13
12
4B
2.4 V
2.4 V
2.4 V
2.4 V
14
13
4Y
OUT
OUT
OUT
OUT
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
Limits
Min
Max
3
23
"
"
"
"
Unit
ns
"
"
3
"
"
28
"
"
ns
"
"
3
"
"
29
"
"
ns
"
"
3
"
"
35
"
"
ns
"
"
MIL-M-38510/1F
23
TABLE III. Group A inspection for device type 08.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
7
9
4A
5.5 V
"
"
2.0 V
5.5 V
"
5.5 V
"
"
0.8 V
5.5 V
"
8
8
4Y
16 mA
5.5 V
9
11
5A
5.5 V
"
"
"
2.0 V
5.5 V
5.5 V
"
"
"
0.8 V
5.5 V
-12mA
-12mA
24
GND
"
"
2.4 V
GND
"
GND
"
"
5.5 V
GND
"
5.5 V
"
"
0.4 V
5.5 V
"
5.5 V
GND
GND
"
"
"
2.4 V
GND
GND
"
"
"
5.5 V
GND
5.5 V
"
"
"
0.4 V
5.5 V
5.5 V
GND
10
10
5Y
16 mA
5.5 V
11
7
GND
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
"
"
"
"
"
"
GND
GND
12
12
6Y
16 mA
5.5 V
13
13
6A
5.5 V
"
"
"
"
2.0 V
5.5 V
"
"
"
"
0.8 V
-12mA
GND
"
"
"
"
2.4 V
GND
"
"
"
"
5.5 V
5.5 V
"
"
"
"
0.4 V
5.5 V
GND
14
2
1Y
16 mA
5.5 V
Measured
terminal
1Y
2Y
3Y
4Y
5Y
6Y
1Y
2Y
3Y
4Y
5Y
6Y
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
1A
2A
3A
4A
5A
6A
VCC
VCC
Limits
Min
Max
0.4
"
"
"
"
"
250
"
"
"
"
"
-1.5
"
"
"
"
"
40
"
"
"
"
"
100
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
30
9.9
Unit
V
"
"
"
"
"
µA
"
"
"
"
"
V
"
"
"
"
"
µA
"
"
"
"
"
µA
"
"
"
"
"
mA
"
"
"
"
"
mA
mA
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
5
6
883
Case C
1
4
3
14
5
6
method
Test no.
1A
2Y
2A
VCC
3A
3Y
1
VOL
3007
1
2.0 V
5.5 V
4.5 V
5.5 V
2
5.5 V
16 mA
2.0 V
"
"
Tc = 25°C
3
"
5.5 V
"
2.0 V
16 mA
4
"
"
"
5.5 V
5
"
"
"
"
6
"
"
"
"
ICEX
7
0.8 V
5.5 V
4.5 V
5.5 V
8
5.5 V
5.5 V
0.8 V
"
"
9
"
5.5 V
"
0.8 V
5.5 V
10
"
"
"
5.5 V
11
"
"
"
"
12
"
"
"
"
VI C
13
-12mA
4.5 V
14
-12mA
"
15
"
-12mA
16
"
17
"
18
"
IIH1
3010
19
2.4 V
GND
5.5 V
GND
20
GND
2.4 V
"
"
21
"
GND
"
2.4 V
22
"
"
"
GND
23
"
"
"
"
24
"
"
"
"
IIH2
3010
25
5.5 V
GND
5.5 V
GND
26
GND
5.5 V
"
"
27
"
GND
"
5.5 V
28
"
"
"
GND
29
"
"
"
"
30
"
"
"
"
IIL
3009
31
0.4 V
5.5 V
5.5 V
5.5 V
32
5.5 V
0.4 V
"
"
33
"
5.5 V
"
0.4 V
34
"
"
"
5.5 V
35
"
"
"
"
36
"
"
"
"
ICCL
3005
37
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
38
GND
GND
5.5 V
GND
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
Subgroup
TABLE III. Group A inspection for device type 08 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Symbol
5
5
3A
6
6
3Y
IN
OUT
7
9
4A
IN
8
8
4Y
9
11
5A
OUT
IN
IN
OUT
IN
OUT
OUT
IN
OUT
IN
IN
OUT
OUT
IN
IN
10
10
5Y
OUT
OUT
IN
OUT
IN
OUT
11
7
GND
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
GND
"
"
"
"
"
12
12
6Y
OUT
13
13
6A
14
2
1Y
OUT
IN
OUT
OUT
IN
OUT
OUT
IN
OUT
OUT
IN
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
5A to 5Y
6A to 6Y
Limits
Min
Max
3
23
"
"
"
"
"
"
"
"
"
"
3
28
"
"
"
"
"
"
"
"
"
"
3
29
"
"
"
"
"
"
"
"
"
"
3
35
"
"
"
"
"
"
"
"
"
"
Unit
ns
"
"
"
"
"
ns
"
"
"
"
"
ns
"
"
"
"
"
ns
"
"
"
"
"
25
MIL-M-38510/1F
MIL-STD- Cases A, B, D
1
2
3
4
883
Case C
1
4
3
14
method
Test no.
1A
2Y
2A
VCC
9
tPHL
3003
39
IN
5.0 V
(Fig. 3)
40
OUT
IN
"
Tc = 25°C
41
"
42
"
43
"
44
"
tPLH
3003
45
IN
5.0 V
(Fig. 3)
46
OUT
IN
"
47
"
48
"
49
"
50
"
10
tPHL
3003
51
IN
5.0 V
(Fig. 3)
52
OUT
IN
"
Tc = 125°C
53
"
54
"
55
"
56
"
tPLH
3003
57
IN
5.0 V
(Fig. 3)
58
OUT
IN
"
59
"
60
"
61
"
62
"
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
Subgroup
TABLE III. Group A inspection for device type 09.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Subgroup
Symbol
MIL-STD883
method
3007
Case C
1
2
3
4
5
6
26
8
9
10
11
12
13
14
GND
GND
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
"
"
"
"
"
"
"
GND
GND
3Y
3A
5.5 V
"
2.0 V
5.5 V
5.5 V
"
"
"
0.8 V
4.5 V
5.5 V
"
3B
5.5 V
"
2.0 V
5.5 V
5.5 V
"
"
"
4.5 V
0.8 V
5.5 V
"
4Y
4A
5.5 V
"
"
2.0 V
5.5 V
"
"
"
"
"
0.8 V
4.5 V
4B
5.5 V
"
"
2.0 V
5.5 V
"
"
"
"
"
4.5 V
0.8 V
VCC
4.5 V
"
"
"
4.5 V
"
"
"
"
"
"
"
4.5 V
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
5.5 V
"
"
"
"
"
"
"
5.5 V
5.5 V
16 mA
5.5 V
"
16 mA
5.5 V
"
-12mA
-12mA
-12mA
GND
"
"
"
2.4 V
GND
"
"
GND
"
"
"
5.5 V
GND
"
"
5.5 V
"
"
"
0.4 V
5.5 V
"
"
5.5 V
GND
GND
"
"
"
"
2.4 V
GND
"
GND
"
"
"
"
5.5 V
GND
"
5.5 V
"
"
"
"
0.4 V
5.5 V
"
5.5 V
GND
GND
"
"
"
"
"
2.4 V
GND
GND
"
"
"
"
"
5.5 V
GND
5.5 V
"
"
"
"
"
0.4 V
5.5 V
5.5 V
GND
-12mA
GND
"
"
"
"
"
"
2.4 V
GND
"
"
"
"
"
"
5.5 V
5.5 V
"
"
"
"
"
"
0.4 V
5.5 V
GND
Measured
terminal
1Y
2Y
3Y
4Y
1Y
1Y
2Y
2Y
3Y
3Y
4Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
1A
1B
2A
2B
3A
3B
4A
4B
VCC
VCC
Limits
Min
Max
0.4
"
"
"
250
"
"
"
"
"
"
"
-1.5
"
"
"
"
"
"
"
40
"
"
"
"
"
"
"
100
"
"
"
"
"
"
"
-0.7
-1.6
"
"
"
"
"
"
"
"
"
"
"
"
"
"
20
6.6
Unit
V
"
"
"
µA
"
"
"
"
"
"
"
V
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
µA
"
"
"
"
"
"
"
mA
"
"
"
"
"
"
"
mA
mA
MIL-M-38510/1F
Test no.
1A
1B
1Y
2A
2B
2Y
1
VOL
1
2.0 V
2.0 V
16 mA
5.5 V
5.5 V
2
5.5 V
5.5 V
2.0 V
2.0 V
16 mA
Tc = 25°C
3
"
"
5.5 V
5.5 V
4
"
"
"
"
ICEX
5
0.8 V
4.5 V
5.5 V
5.5 V
5.5 V
6
4.5 V
0.8 V
"
"
"
7
5.5 V
5.5 V
0.8 V
4.5 V
5.5 V
8
"
"
4.5 V
0.8 V
"
9
"
"
5.5 V
5.5 V
10
"
"
"
"
11
"
"
"
"
12
"
"
"
"
VI C
13
-12mA
14
-12mA
15
-12mA
16
-12mA
17
18
19
20
IIH1
3010
21
2.4 V
GND
GND
GND
22
GND
2.4 V
"
"
23
"
GND
2.4 V
"
24
"
"
GND
2.4 V
25
"
"
"
GND
26
"
"
"
"
27
"
"
"
"
28
"
"
"
"
IIH2
3010
29
5.5 V
GND
GND
GND
30
GND
5.5 V
"
"
31
"
GND
5.5 V
"
32
"
"
GND
5.5 V
33
"
"
"
GND
34
"
"
"
"
35
"
"
"
"
36
"
"
"
"
II L
3009
37
0.4 V
5.5 V
5.5 V
5.5 V
38
5.5 V
0.4 V
"
"
39
"
5.5 V
0.4 V
"
40
"
"
5.5 V
0.4 V
41
"
"
"
5.5 V
42
"
"
"
"
43
"
"
"
"
44
"
"
"
"
ICCL
3005
45
5.5 V
5.5 V
5.5 V
5.5 V
ICCH
3005
46
GND
GND
GND
GND
2
Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C and VI C tests are omitted.
7
TABLE III. Group A inspection for device type 09 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
Subgroup
Symbol
MIL-STD883
method
3003
(Fig. 3)
Case C
1
2
3
4
Test no.
1A
1B
1Y
2A
9
tPHL
47
IN
2.4 V
OUT
48
IN
Tc = 25°C
49
50
tPLH
3003
51
IN
2.4 V
OUT
(Fig. 3)
52
IN
53
54
10
tPHL
3003
55
IN
2.4 V
OUT
(Fig. 3)
56
IN
Tc = 125°C
57
58
tPLH
3003
59
IN
2.4 V
OUT
(Fig. 3)
60
IN
61
62
11
Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
5
6
7
8
9
10
11
12
13
14
2B
2Y
3Y
3A
3B
4Y
4A
4B
2.4 V
OUT
GND
GND
"
"
"
GND
"
"
"
GND
"
"
"
GND
"
"
"
OUT
IN
2.4 V
VCC
5.0 V
"
"
"
5.0 V
"
"
"
5.0 V
"
"
"
5.0 V
"
"
"
2.4 V
2.4 V
2.4 V
OUT
OUT
OUT
OUT
OUT
IN
IN
IN
IN
2.4 V
2.4 V
OUT
OUT
2.4 V
2.4 V
OUT
OUT
IN
IN
2.4 V
2.4 V
OUT
IN
2.4 V
Measured
terminal
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
1A to 1Y
2A to 2Y
3A to 3Y
4A to 4Y
Limits
Min
Max
3
23
"
"
"
"
Unit
ns
"
"
3
"
"
28
"
"
ns
"
"
3
"
"
29
"
"
ns
"
"
3
"
"
35
"
"
ns
"
"
MIL-M-38510/1F
27
MIL-M-38510/1F
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD or in-house contractor
personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements.
Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service
or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the
managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting
the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
PIN and compliance identifier, if applicable (see 1.2).
c.
Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to contracting activity in addition to
notification to the qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883),
corrective action, and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
i.
Requirements for "JAN" marking.
J.
Packaging requirements (see 5.1).
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, P.O. Box 3990, Columbus, Ohio 43218-3990.
28
MIL-M-38510/1F
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ............................................
VIN ...............................................
VI C ..............................................
IIN ................................................
Ground zero voltage potential
Voltage level at an input terminal
Input clamp voltage
Current flowing into an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.3). Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Military device
type
Generic-industry
type
01
02
03
04
05
06
07
08
09
5430
5420
5410
5400
5404
5412
5401
5405
5403
6.8 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect
to the previous issue due to the extensiveness of the changes.
Custodians:
Army - CR
Navy - EC
Air Force - 11
DLA - CC
Preparing activity:
DLA - CC
(Project 5962-2072)
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
NOTE: The activities listed above were interested in this document as of the date of this document. Since
organizations and responsibilities can change, you should verify the currency of the information above using
the ASSIST Online database at http://assist.daps.dla.mil.
29
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