Features Near Field Probe Set PS-400

Features Near Field Probe Set PS-400
Near Field Probe Set
PS-400
Features
Complete Solution - Includes E and H field probes
Locate Noise Source - Down to a pin with the fine tip
Lightweight - Easy to use and handle
Small Size - Allows easy access to corners
Sensitive to Tip Position - Ease of pinpointing source
Immune to Hand Position - For repeatable results
Optional preamplifier
Description
Application
The PS-400 is a Near Field Probe set consist three
probes and a custom storage case. Performance
and ease of use were designed into this product.
The unique design allows easy access for tight or
hard to reach places while reducing the effect of
hand position or cable placement.
The PS-400 Near Field Probe Set is designed to assist
in troubleshooting EMI problems both at the board
level and at the component level. It is used to detect
radiation from cables, cases, traces and ICs.
The fine tip probe is a precision E-field probe that
features the ability to singularly identify a problem
trace or pin. The fine tip probe is designed to be extremely sensitive to distance from the source which
allows easy discrimination between traces on a PCB.
The unique patented design allows measurement
on individual traces as narrow as 3 mils.
The broadband probe is designed to identify E-fields
over a broad frequency range.
The H-field probe's magnetic loop design makes it
ideal for isolating sources of magnetic noise. The
shielded loop construction allows measurement to
minimize the effect of electrical fields.
Com-Power Corporation (949) 587 - 9800
Typically the broadband probe is used to locate
the general area of emission. Then the tip probe is
used to isolate the source to a specific trace or pin.
Further analysis can be done using the contact tip
probe ( available with PS-500 probe set) by making
direct contact with the curcuit and then following
the noisy trace to find the cause of emissions such as
a broken transmission line or impedance mismatch.
A typical use for the H-field probe is to verify the
integrity of the chassis of your computer. This is
done by moving the probe along the seams of the
chassis which may be acting as slot antennas. This
probe is also very useful for detecting magnetic noise
sources such as large current switching circuits or
transformers.
By utilizing the appropriate probes, potential certification problems can be discovered and addressed
before expensive compliance testing is done. This
saves both money and valuable time. The net result
is a reduction in testing costs and a decreased time
to market.
www. com-power.com
[email protected]
Rev. D07.15
Specifications
Probe
Frequency
Type
Connector
Dielectric breakdown
DC input at the tip
Dimensions
Weight
Optional Preamplifier
Model:
Frequency Range:
Nominal Gain:
Pout @ 1 dB comp:
Typical Noise Figure
Output Impedance:
I / O Connection:
Power Input:
Power input plug type:
Weight:
Dimensions (L x W x H):
H-Field loop
9 kHz to 5 GHz
Broadband
50 kHz to 5 GHz
Fine Tip
100 kHz to 5 GHz
H-field
BNC (f)
1 kV
N/A
see below
4 oz / 113 g
E-field
BNC (f)
1 kV
N/A
see below
4 oz / 113 g
E-field
BNC (f)
1 kV
N/A
see below
4 oz / 113 g
PAP-501
10 MHz -1000 MHz
21 dB ± 2
+ 10 dBm
6 dB
50 Ohm
BNC (f) input, BNC (m) Output
6 VDC, 500 mA
2.1 (ID) x 5.5 (OD) center pin positve.
1 lb. (0.45 kg)
83 mm x 42 mm x 25 mm (3.27 " x 1.65" x 0.985")
Mechanical Dimensions
H-Field Loop
Broadband
Fine Tip
U.S. Patent # 5,132,607
Dimensions are given in inches
All values are typical unless specified
Specification are subject to change without notice
Com-Power Corporation (949) 587 - 9800
Rev. D07.15
www. com-power.com
[email protected]
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