TO: Specifications

TO: Specifications
Specifications
Drawing No.
UKY1C-H1-15A51-00[43] 1/11
Issued Date.
Sep,29,2015
TO: Digi-Key
Note:In case of specification change, KYOCERA Part Number also will be changed.
Product Name
Quartz Crystal
Product Model
CX3225SB
Frequency
49152kHz
Customer Part Number
-
Customer Specification Number
-
KYOCERA Part Number
CX3225SB49152F0HELC1
Remarks
Pb-Free、RoHS Compliant、MSL 1
Customer Acceptance
Accept Signature
Approved Date
Department
Person in charge
Seller
KYOCERA Crystal Device Corporation
Manufacturer
(Sales Division)
6 Takeda Tobadono-cho, Fushimi-ku, Kyoto
612-8501 Japan
TEL. No. 075-604-3500
FAX. No. 075-604-3501
Crystal Units Division
Design Department
5850, Higashine-Koh, Higashine-Shi, Yamagata
999-3701 Japan
TEL. No. 0237-43-5611
FAX. No. 0237-43-5615
Quality Assurance
Approved by
Checked by
Issued by
KYOCERA Crystal Device Corporation
Crystal Units Engineering Section
T. Noritake
Y. Takahashi
Crystal Units Division
T. Nitoube
Y. Kikuchi
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 2/11
Revision History
Rev.No.
1
Description of revise
First Edition
Date
Approved by
Checked by
Issued by
Sep,29,2015
Y. Takahashi
T. Nitoube
Y. Kikuchi
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 3/11
1. APPLICATION
This specification sheet is applied to quartz crystal “CX3225SB49152F0HELC1”
2. KYOCERA PART NUMBER
CX3225SB49152F0HELC1
3. RATINGS
Items
SYMB.
Rating
Unit
Operating Temperature
Topr
-10 to +70
°C
Storage Temperature range
Tstg
-40 to +85
°C
Remarks
4. CHARACTERISTICS
ELECTRICAL CHARACTERISTICS
Items
Electrical Specification
SYMB.
Min
Typ.
Max
Mode of Vibration
Fundamental
Test Condition
Unit
Nominal Frequency
F0
49.152
MHz
Nominal
Temperature
Load Capacitance
TNOM
+25
°C
CL
10.0
pF
Frequency
Tolerance
Frequency
Temperature
characteristics
Frequency Aging
Rate
Equivalent Series
Resistance
Drive Level
df/F
-20.0
+20.0
+25±3°C
df/F
-20.0
+20.0
-10 to +70°C
Insulation
Resistance
Remarks
PPM
-1.0
ESR
Pd
0.01
IR
500
1st year
+1.0
50
Ω
100
μW
MΩ
+25±3°C
100V(DC)
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 4/11
5. Measurement Condition
5.1 Frequency measurement
Measuring instrument
: IEC PI-Network Test Fixture
Load Capacitance
: 10.0pF
Drive Level
: 10μW
5.2 Equivalent series resistance (ESR) measurement
Measuring instrument
: IEC PI-Network Test Fixture
Load Capacitance
: Series
Drive Level
: 10μW
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 5/11
6. APPEARANCES, PHYSICAL DIMENSION
OUTLINE DIMENSION (not to scale)
1
(TOP VIEW)
(Connection)
(Top View)
3.20±0.10
#4
#4 GND
#3
2.50±0.10
49152
K501Y
#2
#1 HOT
#2 GND
4-R0.20
3
4
(Side View)
(Bottom View)
PIN
NO.
#1
#2
#3
#4
PIN Layout
HOT
GND
HOT
GND
4-1.0±0.1
#2
#1
4-0.75±0.1
2
0.20±0.04
0.55±0.05
#1
8-0.10±0.1
#3 HOT
C 0.30
UNIT: mm
#4
#3
MARKING
1 Nominal Frequency Move the number of maximum indication beams of the
frequency to five digits,and omit less than kHz.
2 Identification
[K] mark is surely 1Pin direction.
3 Date Code
Year…LAST 1 DIGIT of YEAR AND WEEK
(Ex)Jan, 01, 2015 → 501
4 Manufacturing Location
Y…Japan(Yamagata)
Z…Japan(Shiga Yohkaichi)
T…Thailand
※The font of marking is reference.
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 6/11
7. RECOMMENDED LAND PATTERN (not to scale)
1.0
1.3
1.05
1.85
0.8
1.05
1.3
UNIT: mm
2.3
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 7/11
8.TAPING & REEL
8-1.Dimensions
4.0±0.1
φ1.55±0.05
Unreeling direction
1.75±0.1
2.0±0.05
(3.7)
3.5±0.1
3.5±0.05
(3.0)
2.8±0.1
1.0±0.1
4.0±0.05
0.25±0.05
8.0±0.2
φ1.05±0.1
8-2.Leader and trailer tape
Components
Empty compartment
Empty compartment
Leader
END
START
160mm or more
100~200mm
400~560mm
8-3.Direction(The direction shall be seen from the top cover tape side)
Unreeling direction
12345
K123Y
12345
K123Y
12345
K123Y
12345
K123Y
8-4.Specification
1. Material of the carrier tape is either polystyrene or A-PET (ESD).
2. Material of the cover tape is polyester (ESD).
3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape.
4. Tensile strength of carrier tape: 10N or more.
5. The R of the corner of each cavity is 0.2RMAX.
6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less.
7. The orientation shall be checked from the top cover tape side as shown in 8-3.
8. Peeling force of cover tape: 0.1 to 1.0N.
9. The component will fall out naturally when cover tape is removed and set upside down.
.
165°~180°
Cover tap
Career tape
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 8/11
8-5.Reel Specification
t
W
C
D
E
B
A
In the case of Φ180 Reel (3,000 pcs max, every 1,000 pcs)
Symbol
Dimension
Symbol
Dimension
A
B
C
D
φ180 +0/-3
φ60 +1/-0
φ13±0.2
φ21±0.8
E
W
t
2.0±0.5
9±1
2.0±0.5
(Unit : mm)
In the case of Φ330 Reel (10,000 pcs max, every 1,000 pcs)
Symbol
Dimension
Symbol
Dimension
A
B
C
D
φ330±2.0
φ100±1.0
φ13±0.2
φ21±0.8
E
W
t
2.0±0.5
9.5±0.5
2.2±0.1
(Unit : mm)
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 9/11
9. Environmental requirements
After following test, frequency shall not change more than ±10×10-6
And CI,±20% or 5Ω of large value.
9.1 Resistance to Shock
Test condition
Natural dropped from height 100cm onto hard wood
board in 3 times
9.2 Resistance to Vibration
9.3 Resistance to Heat
Test condition
frequency
: 10 - 55 - 10 Hz
Amplitude
: 1.5mm
Cycle time
: 15 minutes
Direction
: X,Y,Z (3direction),2 h each.
Test condition
The quartz crystal unit shall be stored at a
temperature of +85±2°C for 500 h.
Then it shall be subjected to standard atmospheric
conditions for 1 h ,after whichi measurement shall
be made.
9.4 Resistance to Cold
Test condition
The quartz crystal unit shall be stored at a
temperature of -40±2°C for 500 h.
Then it shall be subjected to standard atmospheric
conditions for 1 h ,after whichi measurement shall
be made.
9.5 Thermal Shock
Test condition
The quartz crystal unit shall be subjected to 500
succesive change of temperature cycles ,each as
shown in table below,Then it shall be subjected
to standard atmospheric conditions for 1h,after
which measurements shall be made.
Cycle
:-40±2°C(30min.)to +25±2°C(5min.)
to +85±2°C(30min.)to +25±2°C(5min.)
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
9.6 Resistance to Moisture
9.7 Soldering condition
UKY1C-H1-15A51-00[43] 10/11
Test condition
The quartz crystal unit shall be stored at a
temperature of +60±2°C wich relative humidity of
90% to 95% for 240 h. Then it shall be subjected
to standard atmospheric conditions for 1h,after
which measurements shall be made
1.) Material of solder
Kind … lead free solder paste
Melting point … +220±5°C
2.) Reflow temp.profile
Temp [°C]
Preheating
+150 to +180
Peak
+260±5
Total
―
Frequency shift : ±2ppm
3.) Hand Soldering +350°C 3 sec MAX
4.) Reflow Times
2 times
Time[sec]
150 (typ.)
10 (max.)
300 (max.)
Reflow temp.profile
9.8 Intensity for bending in circuit board
Solder this product in center of the circuit board of 40mm×100mm,
and add the deflection of 3mm as the bottom figure.
Test board : t=1.6mm
20
PUSH
1.6
board
10
R5
Product
45
45
R230
press jig
UNIT : mm
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-15A51-00[43] 11/11
10. Cautions for use
(1)Soldering upon mounting
There is a possibility to influence product characteristics when Solder paste or conductive glue comes in
contact with product lid or surface.
(2)When using mounting machine
Please minimize the shock when using mounting machine to avoid any excess stress to the product.
(3)Conformity of a circuit
We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 5 times the
ESR (Equivalent Series Resistance) of crystal unit.
11. Storage conditions
Please store product in below conditions, and use within 6 months.
Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition.
12. Manufacturing location
Kyocera Crystal Device Corporation / Japan(Yamagata)
Kyocera Crystal Device Corporation Shiga Yohkaichi Plant / Japan(Shiga)
Kyocera Crystal Device (Thailand) Co., Ltd / Thailand(Lamphun)
13. Quality Assurance
To be guaranteed by Kyocera Crystal Device Quality Assurance Division
14. Quality guarantee
In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery,
substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is
waivered.
15. Others
In case of any questions or opinions regarding the Specification, please have it in written manner
within 45 days after issued date.
KYOCERA Crystal Device Corporation
KBS-5079G
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