Specifications | Agilent Technologies 01664

Service Guide
Publication number 01664-97005
Second edition, January 2000
For Safety information, Warranties, and Regulatory
information, see the pages at the end of the book.
 Copyright Agilent Technologies 1987–2000
All Rights Reserved.
Agilent Technologies 1664A Logic
Analyzer
Agilent Technologies 1664A Logic Analyzer
The Agilent Technologies 1664A is a 50-MHz State/500-MHz Timing Logic Analyzer.
Features
Some of the main features of the 1664A Logic Analyzer is as follows:
• 32 data channels and 2 clock/data channels
• 3.5-inch disk drive
• Centronix (parallel) interface (with GPIB and RS-232C interfaces available as
options)
•
•
•
•
Variable setup/hold time
4 kbytes deep memory on all channels with 8 kbytes in half channel mode
Marker measurements
12 levels of trigger sequencing for state and 10 levels of sequential triggering for
timing
• 100 MHz time and number-of-states tagging
• Full programmability (with optional interface)
Service Strategy
The service strategy for this instrument is the replacement of defective assemblies.
This service guide contains information for finding a defective assembly by testing
and servicing the 1664A.
This logic analyzer can be returned to Agilent Technologies for all service work,
including troubleshooting. Contact your nearest Agilent Technologies Sales Office for
more details.
ii
The Agilent Technologies 1664A Logic Analyzer
iii
In This Book
This book is the service guide for the 1664A Logic Analyzers and is divided into eight chapters.
Chapter 1 contains information about the logic analyzer and includes accessories,
specifications and characteristics, and equipment required for servicing.
Chapter 2 tells how to prepare the logic analyzer for use.
Chapter 3 gives instructions on how to test the performance of the logic analyzer.
Chapter 4 contains calibration instructions for the logic analyzer.
Chapter 5 contains self-tests and flowcharts for troubleshooting the logic analyzer.
Chapter 6 tells how to replace assemblies of the logic analyzer and how to return them to
Agilent Technologies.
Chapter 7 lists replaceable parts, shows an exploded view, and gives ordering information.
Chapter 8 explains how the logic analyzer works and what the self-tests are checking.
iv
Table of Contents
1 General Information
Accessories 1–2
Specifications 1–3
Characteristics 1–3
Supplemental Characteristics 1–4
Recommended Test Equipment 1–8
2 Preparing for Use
To inspect the logic analyzer 2–2
Ferrites 2–3
To apply power 2–4
To operate the user interface 2–4
To set the line voltage 2–4
To degauss the display 2–5
To clean the logic analyzer 2–5
To test the logic analyzer 2–5
3 Testing Performance
To perform the self-tests 3–3
To make the test connectors
3–6
To test the threshold accuracy 3–8
Set up the equipment 3–8
Set up the logic analyzer 3–9
Connect the logic analyzer 3–9
Test the TTL threshold 3–10
Test the ECL threshold 3–12
Test the − User threshold 3–13
Test the + User threshold 3–14
Test the 0 V User threshold 3–15
Test the next pod 3–16
To test the glitch capture 3–17
Set up the equipment 3–17
Set up the logic analyzer 3–18
Connect the logic analyzer 3–18
Test the glitch capture on the connected channels
Test the next channels 3–22
3–20
To test the single-clock, single-edge, state acquisition 3–23
Set up the equipment 3–23
Set up the logic analyzer 3–24
Connect the logic analyzer 3–26
Verify the test signal 3–27
Check the setup/hold combination 3–29
v
Contents
To test the multiple-clock, multiple-edge, state acquisition 1–34
Set up the equipment 1–34
Set up the logic analyzer 1–35
Connect the logic analyzer 1–37
Verify the test signal 1–38
Check the setup/hold with single clock edges, multiple clocks 1–40
To test the single-clock, multiple-edge, state acquisition
Set up the equipment 1–45
Set up the logic analyzer 1–46
Connect the logic analyzer 1–48
Verify the test signal 1–49
Check the setup/hold combination 1–51
To test the time interval accuracy 1–54
Set up the equipment 1–54
Set up the logic analyzer 1–55
Connect the logic analyzer 1–57
Acquire the data 1–58
Performance Test Record 3–59
4 Calibrating and Adjusting
Logic analyzer calibration 4–2
Set up the equipment 4–2
To adjust the CRT monitor alignment 4–3
To adjust the CRT intensity 4–5
5 Troubleshooting
To use the flowcharts 5–2
To check the power-up tests 5–15
To run the self-tests 5–16
To test the power supply voltages 5–21
To test the CRT monitor signals 5–23
To test the keyboard signals 5–24
To test the disk drive voltages 5–25
To perform the BNC test 5–27
To test the logic analyzer probe cables 5–28
To test the auxiliary power 5–32
6 Replacing Assemblies
To remove and replace the handle 6–5
To remove and replace the feet and tilt stand 6–5
To remove and replace the cover 6–5
To remove and replace the disk drive 6–6
To remove and replace the power supply 6–7
vi
1–45
Contents
To remove and replace the Main Circuit board 6–7
To remove and replace the switch actuator assembly 6–8
To remove and replace the rear panel assembly 6–9
To remove and replace the front panel and keyboard 6–10
To remove and replace the intensity adjustment 6–10
To remove and replace the monitor 6–11
To remove and replace the handle plate 6–11
To remove and replace the fan 6–12
To remove and replace the line filter 6–12
To remove and replace the optional GPIB and RS-232C cables 6–13
To return assemblies 6–14
7 Replaceable Parts
Replaceable Parts Ordering 7–2
Exploded View 7–3
Replaceable Parts List 7–4
Power Cables and Plug Configurations 7–8
8 Theory of Operation
Block-Level Theory 8–3
The 1664A Logic Analyzer 8–3
The Logic Acquisition Circuitry 8–6
Self-Tests Description 8–9
Power-up Self-Tests 8–9
System Tests (System PV) 8–10
Analyzer Tests (Analy PV) 8–13
GPIB (Optional) 8–15
RS-232C(Optional) 8–16
Centronix 8–17
vii
Contents
viii
1
Accessories 1-2
Specifications 1-3
Characteristics 1-3
Supplemental Characteristics 1-4
Recommended Test Equipment 1-8
General Information
General Information
This chapter lists the accessories, the specifications and characteristics, and the
recommended test equipment.
Accessories
The following accessories are supplied with the 1664A Logic Analyzers.
Accessories Supplied
Probe tip assemblies
Probe cables
Grabbers (20 per pack)
Probe ground (5 per pack)
User’s Reference
Accessories Pouch
HIL Mouse
Part Number
01650-61608
16550-61601
5090-4356
5959-9334
01660-90904
01660-84501
A2838A
Qty
2
1
2
2
1
1
1
Accessories Available
Other accessories available for the 1664A Logic Analyzer are listed in the Accessories for
Agilent Logic Analyzers brochure. The table below lists additional documentation that is
available from your nearest Agilent Technologies sales office for use with your logic analyzer.
Accessories Available
Demo Training Kit
Programming Reference
Service Guide
1–2
Part Number
E2433-60007
01660-90933
01664-97005
General Information
Specifications
Specifications
The specifications are the performance standards against which the product is tested.
Maximum State Speed
50 MHz
*
3.5 ns
Minimum State Clock Pulse Width
*
Minimum Master to Master Clock Time
20.0 ns
Minimum Glitch Width*
3.5 ns
Threshold Accuracy
Setup/Hold Time:*
Single Clock, Single Edge
Single Clock, Multiple Edges
Multiple Clocks, Multiple Edges
± (100 mV + 3% of
threshold setting)
0.0/3.5 ns through 3.5/0.0 ns,
adjustable in 500-ps increments
0.0/4.0 ns through 4.0/0.0 ns,
adjustable in 500-ps increments
0.0/4.5 ns through 4.5/0.0 ns,
adjustable in 500-ps increments
* Specified for an input signal VH = -0.9 V, VL = -1.7 V, slew rate = 1 V/ns, and threshold = -1.3 V.
Characteristics
These characteristics are not specifications, but are included as additional information.
Full Channel
Half Channel
Maximum State Clock Rate
50 MHz
50 MHz
Maximum Conventional Timing Rate
250 MHz
500 MHz
Maximum Transitional Timing Rate
125 MHz
250 MHz
Maximum Timing with Glitch Rate
N/A
125 MHz
Memory Depth
4K
8K*
Channel Count:
34
17
* For all modes except glitch.
1–3
General Information
Supplemental Characteristics
Supplemental Characteristics
Probes
Input Resistance
Input Capacitance
Minimum Voltage Swing
100 kΩ, ± 2%
~ 8 pF
500 mV, peak-to-peak
Threshold Range
± 6.0 V, adjustable in 50-mV increments
State Analysis
State/Clock Qualifiers
Time Tag Resolution*
Maximum Time Count
Between States
6
8 ns or 0.1%, whichever is greater
34 seconds
Maximum State Tag Count 4.29 x 109
*
Timing Analysis
Sample Period Accuracy 0.01 % of sample period
Channel-to-Channel Skew 2 ns, typical
Time Interval Accuracy
± [sample period + channel-to-channel skew
+(0.01%)(time reading)]
Triggering
Sequencer Speed
State Sequence Levels
Timing Sequence Levels
Maximum Occurrence Counter
Value
Pattern Recognizers
Maximum Pattern Width
Range Recognizers
Range Width
Timers
Timer Value Range
Glitch/Edge Recognizers
Maximum Glitch/Edge Width
125 MHz, maximum
12
10
1,048,575
10
34 channels
2
32 bits each
2
400 ns to 500 seconds
2 (timing only)
34 channels
*Maximum state clock rate with time or state tags on is 50 MHz. When all pods are assigned to a state or timing
machine, time or state tags halve the memory depth.
1–4
General Information
Supplemental Characteristics
Measurement and Display Functions
Displayed Waveforms 24 lines maximum, with scrolling across 96 waveforms.
Measurement Functions
Run/Stop Functions Run starts acquisition of data in specified trace mode.
Stop In single trace mode or the first run of a repetitive acquisition, Stop halts
acquisition and displays the current acquisition data. For subsequent runs in repetitive
mode, Stop halts acquisition of data and does not change the current display.
Trace Mode Single mode acquires data once per trace specification. Repetitive mode
repeats single mode acquisitions until Stop is pressed or until the time interval between
two specified patterns is less than or greater than a specified value, or within or not within
a specified range.
Indicators
Activity Indicators Provided in the Configuration and Format menus for identifying
high, low, or changing states on the inputs.
Markers Two markers (X and O) are shown as vertical dashed lines on the display.
Trigger Displayed as a vertical dashed line in the Timing Waveform display and as line 0
in the State Listing display.
Data Entry/Display
Labels Channels may be grouped together and given a 6-character name. Up to
126 labels in each analyzer may be assigned with up to 32 channels per label.
Display Modes State listing, State Waveforms, Chart, Compare Listing, Compare
Difference Listing, Timing Waveforms, and Timing Listings. State Listing and Timing
Waveforms can be time-correlated on the same displays.
Timing Waveform Pattern readout of timing waveforms at X or O marker.
Bases Binary, Octal, Decimal, Hexadecimal, ASCII (display only), Two’s Complement,
and User-defined symbols.
Symbols 1,000 maximum. Symbols can be downloaded over RS-232 or GPIB.
1–5
General Information
Supplemental Characteristics
Marker Functions
Time Interval The X and O markers measure the time interval between a point on a
timing waveform and the trigger, two points on the same timing waveform, two points on
different waveforms, or two states (time tagging on).
Delta States (state analyzer only) The X and O markers measure the number of
tagged states between one state and trigger or between two states.
Patterns The X and O markers can be used to locate the nth occurrence of a specified
pattern from trigger, or from the beginning of data. The O marker can also find the nth
occurrence of a pattern from the X marker.
Statistics X and O marker statistics are calculated for repetitive acquisitions. Patterns
must be specified for both markers, and statistics are kept only when both patterns can be
found in an acquisition. Statistics are minimum X to O time, maximum X to O time,
average X to O time, and ratio of valid runs to total runs.
Auxiliary Power
Power Through Cables
1/3 amp at 5 V maximum per cable
Operating Environment
Temperature
Humidity
Altitude
Vibration
Dimensions
1–6
Instrument, 0 °C to 55 °C (+32 °F to 131 °F).
Probe lead sets and cables,
0 °C to 65 °C (+32 °F to 149 °F).
Instrument, probe lead sets, and cables, up to
95% relative humidity at +40 °C (+122 °F).
To 4600 m (15,000 ft).
Operating: Random vibration 5 to 500 Hz,
10 minutes per axis, ≈0.3 g (rms).
Non-operating: Random vibration 5 to 500 Hz,
10 minutes per axis, ≈ 2.41 g (rms);
and swept sine resonant search, 5 to 500 Hz,
0.75 g (0-peak), 5 minute resonant dwell
at 4 resonances per axis.
General Information
Supplemental Characteristics
Product Regulations
Safety
EMC
Emissions
Immunity
IEC 348
UL 1244
CSA Standard C22.2 No.231 (Series M-89)
This product meets the requirement of the European
Communities (EC) EMC Directive 89/336/EEC.
EN55011/CSIPR 11 (ISM, Group1,Class A equipment)
SABS RAA Act No. 24(1990)
EN50082-1
Code1 Notes2
IEC 801-2 (ESD)4kV CD, 8kV AD
2
IEC 801-3 (Rad.) 3V/m
1
2
IEC 801-4 (EFT) 1kV
1
Performance Codes:
1 PASS - Normal operations, no effect.
2 PASS - Temporary degradation, self recoverable.
3 PASS - Temporary degradation, operator intervention required.
4 FAIL - Not recoverable, component damage.
2
Notes: (None)
1–7
General Information
Recommended Test Equipment
Recommended Test Equipment
Equipment Required
Equipment
Critical Specifications
Pulse Generator
100 MHz, 3.5 ns pulse width,
< 600 ps rise time
≥ 6 GHz bandwidth, < 58 ps rise time
Accuracy ≤ (5)(10−6) × frequency,
DC offset voltage ±6.3 V
0.1 mV resolution, 0.005% accuracy
Digitizing Oscilloscope
Function Generator
Digital Multimeter
BNC-Banana Cable
BNC Tee
Cable
SMA Coax Cable (Qty 3)
Adapter (Qty 4)
Adapter
Coupler (Qty 4)
20:1 Probes (Qty 2)
BNC Test Connector, 17x2
(Qty 1)**
BNC Test Connector, 6x2
(Qty 4)**
Digitizing Oscilloscope
BNC Shorting Cap
BNC-Banana Adapter
Light Power Meter
Alignment Tool
*A = Adjustment
BNC (m)(f)(f)
BNC (m)(m) 48 inch > 2GHz bandwidth
18 GHz bandwidth
SMA(m)-BNC(f)
SMA(f)-BNC(m)
BNC (m)(m)
Recommended
Use*
Model/Part
Agilent 8131A Option 020 P,T
Agilent 54121T
P
Agilent 3325B Option 002 P
Agilent 3458A
Agilent 11001-60001
Agilent 1250-0781
Agilent 8120-1840
Agilent 8120-4948
Agilent 1250-1200
Agilent 1250-2015
Agilent 1250-0216
Agilent 54006A
P,T
> 100 MHz Bandwidth
P = Performance Tests
Agilent 54600A
Agilent 1250-0074
Agilent 1251-2277
United Detector 351
8710-1300
T = Troubleshooting
**Instructions for making these test connectors are in chapter 3, "Testing Performance."
1–8
P
P
P
P,T
P
P, T
P
P, T
P
P
T
T
T
A
A
2
To inspect the logic analyzer 2-2
Ferrites 2-3
To apply power 2-4
To operate the user interface 2-4
To set the line voltage 2-4
To degauss the display 2-5
To clean the logic analyzer 2-5
To test the logic analyzer 2-5
Preparing for Use
Preparing For Use
This chapter gives you instructions for preparing the logic analyzer for use.
Power Requirements
The logic analyzer requires a power source of either 115 Vac or 230 Vac, –22 % to
+10 %, single phase, 48 to 66 Hz, 200 Watts maximum power.
Operating Environment
The operating environment is listed in chapter 1. Note the noncondensing humidity
limitation. Condensation within the instrument can cause poor operation or
malfunction. Provide protection against internal condensation.
The logic analyzer will operate at all specifications within the temperature and
humidity range given in chapter 1. However, reliability is enhanced when operating
the logic analyzer within the following ranges:
• Temperature: +20 °C to +35 °C (+68 °F to +95 °F)
• Humidity: 20% to 80% noncondensing
Storage
Store or ship the logic analyzer in environments within the following limits:
• Temperature: -40 °C to + 75 °C
• Humidity: Up to 90% at 65 °C
• Altitude: Up to 15,300 meters (50,000 feet)
Protect the logic analyzer from temperature extremes which cause condensation on
the instrument.
To inspect the logic analyzer
1 Inspect the shipping container for damage.
If the shipping container or cushioning material is damaged, keep them until you have
checked the contents of the shipment and checked the instrument mechanically and
electrically.
2 Check the supplied accessories.
Accessories supplied with the logic analyzer are listed in "Accessories" in chapter 1.
3 Inspect the product for physical damage.
Check the logic analyzer and the supplied accessories for obvious physical or mechanical
defects. If you find any defects, contact your nearest Agilent Technologies Sales Office.
Arrangements for repair or replacement are made, at Agilent Technologies’ option, without
waiting for a claim settlement.
2–2
Preparing for Use
Ferrites
Ferrites
Ferrites are included in the 1664A accessory pouch for the logic analyzer cable. When
properly installed, the ferrites reduce RFI emissions from the logic analyzer.
In order to ensure compliance of the 1664A Logic Analyzer to the CISPR11 Class A radio
frequency interference (RFI) limits, you must install the ferrite to absorb radio frequency
energy.
Note: Adding or removing the ferrite will not affect the normal operation of the analyzer.
Ferrite Installation Instructions
Use the following steps to install the ferrite on the logic analyzer cable.
1 Place the ferrite halves and spacer on the logic analyzer cable like a clamshell
around the whole cable. The ferrite should be 10 cm (about 4 in) from the the end of
the cable shell as shown.
2 Insert the clamps onto the ends of the ferrites. The locking tab should fit cleanly in
the ferrite grooves.
When properly installed, the ferrite should appear on the logic analyzer cable as shown.
2–3
Preparing for Use
To apply power
To apply power
CAUTION
Electrostatic discharge can damage electronic components. Use grounded wriststraps and
mats when performing any service to the logic analyzer.
1 Check that the line voltage selector, located on the rear panel, is on the correct
setting and the correct fuse is installed.
See also, "To set the line voltage" on this page.
2 Connect the power cord to the instrument and to the power source.
This instrument is equipped with a three-wire power cable. When connected to an
appropriate ac power outlet, this cable grounds the instrument cabinet. The type of power
cable plug shipped with the instrument depends on the country of destination. Refer to
chapter 7, "Replaceable Parts," for option numbers of available power cables and plug
configurations.
3 Turn on the instrument power switch located on the front panel.
To operate the user interface
To select a field on the logic analyzer screen, use the arrow keys to highlight the
field, then press the Select key. For more information about the logic analyzer
interface, refer to the Agilent Technologies 1660 Series Logic Analyzer User’s
Reference.
To set the GPIB address or to configure for RS-232C, refer to the Agilent
Technologies 1660 Series Logic Analyzer User’s Reference.
To set the line voltage
When shipped from the factory, the line voltage selector is set and an appropriate fuse is
installed for operating the instrument in the country of destination. To operate the
instrument from a power source other than the one set, perform the following steps.
2–4
Preparing for Use
To degauss the display
1 Turn the power switch to the Off position, then remove the power cord from the
instrument.
2 Remove the fuse module by carefully prying at the top center of the fuse module
until you can grasp it and pull it out by hand.
3 Reinsert the fuse module with the arrow for the appropriate line voltage aligned
with the arrow on the line filter assembly switch.
4 Reconnect the power cord. Turn on the instrument by setting the power switch to
the On position.
To degauss the display
If the logic analyzer has been subjected to strong magnetic fields, the CRT might
become magnetized and display data might become distorted. To correct this
condition, degauss the CRT with a conventional external television type degaussing
coil.
To clean the logic analyzer
With the instrument turned off and unplugged, use mild soap and water to clean the
front and cabinet of the logic analyzer. Harsh soap might damage the water-base
paint.
To test the logic analyzer
• If you require a test to verify the specifications, start at the beginning of chapter 3,
"Testing Performance."
• If you require a test to initially accept the operation, perform the self-tests in
chapter 3.
• If the logic analyzer does not operate correctly, go to the beginning of chapter 5,
"Troubleshooting."
2–5
2–6
3
To perform the self-tests 3-3
To make the test connectors 3-6
To test the threshold accuracy 3-8
To test the glitch capture 3-17
To test the single-clock, single-edge, state acquisition 3-23
To test the multiple-clock, multiple-edge, state acquisition 3-34
To test the single-clock, multiple-edge, state acquisition 3-45
To test the time interval accuracy 3-54
Performance Test Record 3-59
Testing Performance
Testing Performance
This chapter tells you how to test the performance of the logic analyzer against the
specifications listed in chapter 1. To ensure the logic analyzer is operating as
specified, you perform software tests (self-tests) and manual performance tests on
the analyzer. The logic analyzer is considered performance-verified if all of the
software tests and manual performance tests have passed. The procedures in this
chapter indicate what constitutes a "Pass" status for each of the tests.
The Logic Analyzer Interface
To select a field on the logic analyzer screen, use the arrow keys to highlight the field,
then press the Select key. For more information about the logic analyzer interface,
refer to the Agilent Technologies 1660 Series Logic Analyzer User’s Reference.
Test Strategy
For a complete test, start at the beginning with the software tests and continue
through to the end of the chapter. For an individual test, follow the procedure in the
test. The examples in this chapter were performed using an 1664A.
The performance verification procedures starting on page 3–8 are each shown from
power-up. To exactly duplicate the set-ups in the tests, save the power-up
configuration to a file on a disk, then load that file at the start of each test.
If a test fails, check the test equipment set-up, check the connections, and verify
adequate grounding. If a test still fails, the most probable cause of failure would be
the main circuit board.
Test Interval
Test the performance of the logic analyzer against specifications at two-year intervals
or if it is replaced or repaired.
Performance Test Record
A performance test record for recording the results of each procedure is located at
the end of this chapter. Use the performance test record to gauge the performance
of the logic analyzer over time.
Test Equipment
Each procedure lists the recommended test equipment. You can use equipment that
satisfies the specifications given. However, the procedures are based on using the
recommended model or part number. Before testing the performance of the logic
analyzer, warm-up the instrument and the test equipment for 30 minutes.
3–2
To perform the self-tests
The self-tests verify the correct operation of the logic analyzer. Self-tests can be
performed all at once or one at a time. While testing the performance of the logic
analyzer, run the self-tests all at once.
1 Disconnect all inputs, insert the boot disk, then turn on the power switch. Wait until
the power-up tests are complete.
2 Press the System key. Select the field next to System, then select Test in the pop-up
menu then press the Select key.
3 Select the box labeled Load Test System then press the Select key. Load the disk
containing the performance verification (self-tests) into the disk drive (normally the
same as the boot disk).
4 Select the box labeled Continue and press the Select key.
5 After the test files have been loaded, the Analy PV menu is displayed. Select All
Analyzer Tests.
You can run all tests at one time, except for the Data Input Inspection, by running All
Analyzer Tests. To see more details about each test when troubleshooting failures, you can
run each test individually. This example shows how to run all tests at once.
When the tests finish, the status for each test shows Passed or Failed, and the status
for the All Analyzer Tests changes from Untested to Tested.
6 Select Analy PV, then select Sys PV in the pop-up menu.
3–3
Testing Performance
To perform the self-tests
7 Select the Printer/Controller field next to Sys PV, then select System Test in the
pop-up menu then press the Select key.
8 Install a formatted disk that is not write protected into the disk drive. If the 1664A
has the RS-232C option (020), connect an RS-232C loopback connector onto the
RS-232C port.
9 Select All System Tests.
You can run all tests at one time, except for the Front Panel Test and Display Test, by running
All System Tests. To see more details about each test when troubleshooting failures, you can
run each test individually. This example shows how to run all tests at once.
When the tests finish, the status for each test shows Passed or Failed, and the status for the
All System Tests changes from Untested to Tested. Note that the Front Panel Test and
Display Test remain Untested, and the RS-232C Test will display FAILED if option 020 is not
installed.
10 Select the Front Panel Test.
A screen duplicating the front panel appears on the screen.
a Press each key on the front panel. The corresponding key on the screen will change
from a light to a dark color. Test the knob by turning it in both directions.
b Note any failures, then press the Done key a second time to exit the Front Panel Test.
The status of the test changes from Untested to Tested.
3–4
Testing Performance
To perform the self-tests
11 Select the Display Test.
A white grid pattern is displayed. These display screens are not normally used, but can be
used to adjust the display. Refer to chapter 4, "Calibrating and Adjusting" for display
adjustments.
a Select Continue and the screen changes to full bright.
b Select Continue and the screen changes to half bright.
c Select Continue and the test screen shows the Display Test status changed to Tested.
12 Record the results of the tests on the performance test record at the end of this
chapter.
13 To exit the test system, press the System key, then select Exit Test in the pop-up
menu and press the Select key. Reinstall the disk containing the operating system,
then select Exit Test System and press the Select key.
3–5
To make the test connectors
The test connectors connect the logic analyzer to the test equipment.
Materials Required
Description
Recommended Part
Qty
BNC (f) Connector
Agilent 1250-1032
5
100 Ω 1% resistor
Agilent 0698-7212
8
Berg Strip, 17-by-2
1
Berg Strip, 6-by-2
4
20:1 Probe
Agilent 54006A
2
Jumper wire
1 Build four test connectors using BNC connectors and 6-by-2 sections of Berg strip.
a Solder a jumper wire to all pins on one side of the Berg strip.
b Solder a jumper wire to all pins on the other side of the Berg strip.
c Solder two resistors to the Berg strip, one at each end between the end pins.
d Solder the center of the BNC connector to the center pin of one row on the Berg strip.
e Solder the ground tab of the BNC connector to the center pin of the other row on the
Berg strip.
f On two of the test connectors, solder a 20:1 probe. The probe ground goes to the
same row of pins on the test connector as the BNC ground tab.
3–6
Testing Performance
To make the test connectors
2 Build one test connector using a BNC connector and a 17-by-2 section of Berg strip.
a Solder a jumper wire to all pins on one side of the Berg strip.
b Solder a jumper wire to all pins on the other side of the Berg strip.
c Solder the center of the BNC connector to the center pin of one row on the Berg strip.
d Solder the ground tab of the BNC connector to the center pin of the other row on the
Berg strip.
3–7
To test the threshold accuracy
Testing the threshold accuracy verifies the performance of the following specification:
• Clock and data channel threshold accuracy.
These instructions include detailed steps for testing the threshold settings of pod 1.
After testing pod 1, connect and test pod 2. To test pod 2, follow the detailed steps
for pod 1, substituting the pod 2 for pod 1 in the instructions.
Each threshold test tells you to record the voltage reading in the performance test
record located at the end of this chapter. To check if each test passed, verify that the
voltage reading you record is within the limits listed on the performance test record.
Equipment Required
Equipment
Digital Multimeter
Function Generator
BNC-Banana Cable
BNC Tee
BNC Cable
BNC Test Connector, 17x2
Critical Specifications
0.1 mV resolution, 0.005% accuracy
DC offset voltage ±6.3 V
Recommended Model/Part
Agilent 3458A
Agilent 3325B Option 002
Agilent 11001-60001
Agilent 1250-0781
Agilent 8120-1840
Set up the equipment
1 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes before beginning the test.
2 Set up the function generator.
a Set up the function generator to provide a DC offset voltage at the Main Signal output.
b Disable any AC voltage to the function generator output, and enable the high voltage
output.
c Monitor the function generator DC output voltage with the multimeter.
3–8
Testing Performance
To test the threshold accuracy
Set up the logic analyzer
1 Press the Config key. Assign all pod fields to Machine 1. To assign the pod fields,
select the pod fields, then select Machine 1 in the pop-up menu.
2 In the Analyzer 1 box, select the Type field. Select Timing in the pop-up menu.
Connect the logic analyzer
1 Using the 17-by-2 test connector, BNC cable, and probe tip assembly, connect the
data and clock channels of pod 1 to one side of the BNC Tee.
2 Using a BNC-banana cable, connect the voltmeter to the other side of the BNC Tee.
3 Connect the BNC Tee to the Main Signal output of the function generator.
3–9
Testing Performance
To test the threshold accuracy
Test the TTL threshold
1 Press the Format key. Select the field to the right of Pod 1, then select TTL in the
pop-up menu.
2 On the function generator front panel, enter 1.647 V ±1 mV DC offset. Use the
multimeter to verify the voltage.
The activity indicators for pod 1 should show all data channels and the J-clock channel at a
logic high.
3 Using the Modify down arrow on the function generator, decrease offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
low. Record the function generator voltage in the performance test record.
3–10
Testing Performance
To test the threshold accuracy
4 Using the Modify up arrow on the function generator, increase offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
high. Record the function generator voltage in the performance test record.
3–11
Testing Performance
To test the threshold accuracy
Test the ECL threshold
1 Select the field to the right of Pod 1, then select ECL in the pop-up menu.
2 On the function generator front panel, enter −1.160 V ±1 mV DC offset. Use the
multimeter to verify the voltage.
The activity indicators for pod 1 should show all data channels and the J-clock channel at a
logic high.
3 Using the Modify down arrow on the function generator, decrease offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels are at a
logic low. Record the function generator voltage in the performance test record.
4 Using the Modify up arrow on the function generator, increase offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels are at a
logic high. Record the function generator voltage in the performance test record.
3–12
Testing Performance
To test the threshold accuracy
Test the − User threshold
1 Move the cursor to the field to the right of Pod 1. Type –6.00, then use the left and
right cursor control keys to highlight V. Press the Select key.
2 On the function generator front panel, enter −5.718 V ±1 mV DC offset. Use the
multimeter to verify the voltage.
The activity indicators for pod 1 should show all data channels and the J-clock channel at a
logic high.
3 Using the Modify down arrow on the function generator, decrease offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
low. Record the function generator voltage in the performance test record.
4 Using the Modify up arrow on the function generator, increase offset voltage in
1-mV increments until all activity indicators show the channels at a logic high.
Record the function generator voltage in the performance test record.
3–13
Testing Performance
To test the threshold accuracy
Test the + User threshold
1 Move the cursor to the field to the right of Pod 1. Type +6.00, then use the left and
right cursor control keys to highlight V. Press the Select key.
2 On the function generator front panel, enter +6.282 V ±1 mV DC offset. Use the
multimeter to verify the voltage.
The activity indicators for pod 1 should show all data channels and the J-clock channel at a
logic high.
3 Using the Modify down arrow on the function generator, decrease offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
low. Record the function generator voltage in the performance test record.
4 Using the Modify up arrow on the function generator, increase offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
high. Record the function generator voltage in the performance test record.
3–14
Testing Performance
To test the threshold accuracy
Test the 0 V User threshold
1 Move the cursor to the field to the right of Pod 1. Type 0, then press the Select key.
2 On the function generator front panel, enter +0.102 V ±1 mV DC offset. Use the
multimeter to verify the voltage.
The activity indicators for pod 1 should show all data channels and the J-clock channel at a
logic high.
3 Using the Modify down arrow on the function generator, decrease offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
low. Record the function generator voltage in the performance test record.
4 Using the Modify up arrow on the function generator, increase offset voltage in
1-mV increments until all activity indicators for pod 1 show the channels at a logic
high. Record the function generator voltage in the performance test record.
3–15
Testing Performance
To test the threshold accuracy
Test the next pod
1 Using the 17-by-2 test connector and probe tip assembly, connect the data and clock
channels of pod 2 to the output of the function generator.
2 Start with "Test the TTL threshold" on page 3−10, substituting pod 2 for pod 1.
3–16
To test the glitch capture
Testing the glitch capture verifies the performance of the following specification:
• Minimum detectable glitch.
This test checks the minimum detectable glitch on sixteen data channels at a time.
Equipment Required
Equipment
Pulse Generator
Digitizing Oscilloscope
SMA Coax
(Qty 3)
Adapter (Qty 4)
Coupler (Qty 4)
BNC Test Connector, 6x2 (Qty 4)
Critical Specifications
100 MHz 3.5 ns pulse width, < 600 ps rise time
≥ 6 GHz bandwidth , < 58 ps rise time
18 GHz bandwidth
Recommended Model/Part
Agilent 8131A Option 020
Agilent 54121T
Agilent 8120-4948
SMA(m)-BNC(f)
BNC (m)(m)
Agilent 1250-1200
Agilent 1250-0216
Set up the equipment
1 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes before beginning the test if you have not already done so.
2 Set up the pulse generator.
Pulse Generator Setup
Channel 1
Channel 2
Period
Delay: 0 ps
Delay : 0 ps
22.0 ns
Width: 3.5 ns
Width: 3.5 ns
High: −0.9 V
High: −0.9 V
Low: −1.7 V
Low: −1.7 V
3–17
Testing Performance
To test the glitch capture
3 Set up the oscilloscope.
Oscilloscope Setup
Time Base
Display
Delta V
Delta T
Time/Div: 1.00 ns/div
mode: avg
V markers on
T markers on
delay: 17.7000 ns
# of avg: 16
marker 1 position: Chan 1
start on: Pos Edge 1
screens: dual
marker 2 position: Chan 2
stop on: Pos Edge 1
Channel 1
Channel 2
Display
on
on
Probe Atten
20.00
20.00
Volts/Div
400 mV
400 mV
Offset
−1.3000 V
−1.3000 V
Channel
Set up the logic analyzer
1 Press the Config key. Assign all pod fields to Machine 1. To assign the pod fields,
select the pod fields, then select Machine 1 in the pop-up menu.
2 In the Analyzer 1 box, select the Type field. Select Timing in the pop-up menu.
Connect the logic analyzer
1 Using SMA cables, connect the oscilloscope to the pulse generator channel 1
Output, channel 2 Output, and Trig Output.
2 Using the 6-by-2 test connectors, connect the first combination of logic analyzer
clock and data channels listed in the table to the pulse generator.
You will repeat this test for the remaining combinations.
3–18
Testing Performance
To test the glitch capture
Connect the Logic Analyzer to the Pulse Generator
Testing
Combinations
To Agilent 8131A
Channel 1 Output
To 8131A Channel
1 Output
To 8131A Channel
2 Output
To 8131A Channel
2 Output
1
Pod 1
ch 0, 2, 4, 6,
J-clock
Pod 1
ch 1, 3, 5, 7
Pod 1
ch 8, 10, 12, 14
Pod 1
ch 9, 11, 13, 15
2
Pod 2
ch 0, 2, 4, 6,
K-clock
Pod 2
ch 1, 3, 5, 7
Pod 2
ch 8, 10, 12, 14
Pod 2
ch 9, 11, 13, 15
3–19
Testing Performance
To test the glitch capture
Test the glitch capture on the connected channels
1 Set up the Format menu.
a Press the Format key.
b Select the field to the right of the pod, then select ECL in the pop-up menu. Use the
arrow keys to access pods not shown on the screen (select the Pods field and push
Select).
c Select Timing Acquisition Mode, then select Glitch Half Channel 125 MHz.
2 Turn on the channels that correspond to the channels being tested.
The channels being tested are the channels connected to the pulse generator in "Connect the
logic analyzer."
a Select the pod field, then select one of the two pods in the pop-up. Move the cursor to
the channel assignment field of the pod and press the Clear entry key until all
channels of the pod are assigned (all asterisks). Press the Done key.
b Turn on the clock/data channels that correspond to the clocks being tested. Turn off
the data channels and clock/data channels that are not being tested.
3–20
Testing Performance
To test the glitch capture
3 Set up the Trigger menu.
a Press the Trigger key.
b Select Modify Trigger, then Clear Trigger, then select All in the pop-up menus.
4 Using the Precision Edge Find in the Delta T menu of the oscilloscope, verify that
the pulse widths of the pulse generator channels 1 and 2 are 3.450 ns, +50 ps or −100
ps. If necessary, adjust the pulse widths of the pulse generator channels 1 and 2.
5 Set up the Waveform menu to view all the channels.
a Select one of the Glitch labels, then select Delete All in the pop-up menu.
b Select All, then select continue.
c Press the Select key, then select Insert in the pop-up menu.
d Press the Select key, then select Sequential in the pop-up menu.
3–21
Testing Performance
To test the glitch capture
6 On the logic analyzer, press the Run key. The display should be similar to the figure
below.
7 On the pulse generator, enable Channel 1 and Channel 2 COMP (with the LED on).
8 On the logic analyzer, press the Run key. The display should be similar to the figure
below. Record Pass or Fail in the performance test record.
Test the next channels
• Return to "Connect the logic analyzer" on page 3–18 and connect and test the next
combination of data and clock channels until all pods are tested.
To access pod 2 in the Format menu, select pod 1 field, then select pod 2 in the pop-up menu.
3–22
To test the single-clock, single-edge, state acquisition
Testing the single-clock, single-edge, state acquisition verifies the performance of the
following specifications:
•
•
•
•
Minimum master to master clock time.
Maximum state acquisition speed.
Setup/Hold time for single-clock, single-edge, state acquisition.
Minimum clock pulse width.
This test checks the data channels using a single-edge clock at three selected
setup/hold times.
Equipment Required
Equipment
Pulse Generator
Digitizing Oscilloscope
Adapter
SMA Coax Cable (Qty 3)
BNC Cable
Coupler
BNC Test Connector,
6x2 (Qty 4)
Critical Specifications
100 MHz 3.5 ns pulse width, < 600 ps rise time
≥ 6 GHz bandwidth, < 58 ps rise time
SMA(m)-BNC(f)
18 GHz bandwidth
BNC(m)(m) 48 in. >2 GHz bandwidth
BNC(m)(m)
Recommended Model/Part
Agilent 8131A option 020
Agilent 54121T
Agilent 1250-1200
Agilent 8120-4948
Agilent 8120-1840
Agilent 1250-0216
Set up the equipment
1 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes before beginning the test if you have not already done so.
2 Set up the pulse generator.
a Set up the pulse generator according to the following table.
Pulse Generator Setup
Channel 1
Channel 2
Period
Delay: 0 ps
Doub: 20.0 ns
40 ns
Width: 3.5 ns
Width: 3.5 ns
High: -0.9 V
High: -0.9 V
Low: -1.7 V
Low: -1.7 V
b Disable the pulse generator channel 2 COMP (with the LED off).
3–23
Testing Performance
To test the single-clock, single-edge, state acquisition
3 Set up the oscilloscope.
Oscilloscope Setup
Time Base
Display
Delta V
Delta T
Time/Div: 1.00 ns/div
avg
V markers on
T markers on
# of avg: 16
marker 1 position: Chan 1
start on: Pos Edge 1
screen: dual
marker 2 position: Chan 1
stop on: Neg Edge 1
Channel
Channel 1
Channel 2
Display
on
on
Probe Atten
20.00
20.00
Offset
−1.3 V
−1.3 V
Volts/Div
400 mV
400 mV
Set up the logic analyzer
1 Set up the Configuration menu.
a Press the Config key.
b In the Configuration menu, assign all pods to Machine 1. To assign the pods, select
the pod fields, then select Machine 1 in the pop-up menu.
c Select the Type field in the Analyzer 1 box, then select State.
3–24
Testing Performance
To test the single-clock, single-edge, state acquisition
2 Set up the Format menu.
a Press the Format key. Select State Acquisition Mode, then select Full Channel/4K
Memory/50MHz.
b Select the field to the right of each pod, then select ECL in the pop-up menu.
3 Set up the Trigger menu.
a Press the Trigger key. Select Modify Trigger, then Clear Trigger, then select All in the
pop-up menus.
b Select Count Off. Press Select again, then select Time in the pop-up menu. Select
Done to exit the menu.
c Select the field labeled 1 under the State Sequence Levels. Select the field labeled
"anystate," then select "no state." Select Done to exit the State Sequence Levels menu.
d Select the field next to "a," under the label Lab1. Type "000A", then press the Select
key.
3–25
Testing Performance
To test the single-clock, single-edge, state acquisition
Connect the logic analyzer
1 Using the 6-by-2 test connectors, connect the logic analyzer clock and data channels
listed in the following table to the pulse generator. Install a BNC cable between the
pulse generator channel 2 output and the 6x2 test connector with the logic analyzer
clock leads.
2 Using SMA cables, connect the oscilloscope to the pulse generator channel 1
Output, channel 2 Output, and Trig Output.
Connect the 1664A Logic Analyzer to the Pulse Generator
Testing
Combination
Connect to
Agilent 8131A
Channel 1 Output
Connect to
Agilent 8131A
Channel 1 Output
Connect to
Agilent 8131A
Channel 2 Output
1
Pod 1, channel 3
Pod 2, channel 3
Pod 1, channel 11
Pod 2, channel 11
J-clock
3 Activate the data channels that are connected according to the previous table.
a Press the Format key.
b Select the field showing the channel assignments for one of the pods being tested,
then press the Clear entry key. Using the arrow keys, move the selector to the data
channels to be tested, then press the Select key. An asterisk means that a channel is
turned on. When all the correct channels of the pod are turned on, press the Done
key. Follow this step for the remaining pods.
3–26
Testing Performance
To test the single-clock, single-edge, state acquisition
c Press the Trigger key. Make sure pattern term a is "A". If not, select the field next to
"a" under the label Lab1. Type "A", then press the Select key.
Verify the test signal
1 Check the clock pulse width. Using the oscilloscope, verify that the clock pulse
width is 3.50 ns, +0 ps or −100 ps.
a Enable the pulse generator channel 1 and channel 2 outputs.
b In the oscilloscope Timebase menu, select Delay. Using the oscilloscope knob,
position the clock waveform so that the waveform is centered on the screen.
c In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 2, then set
Marker 1 at −1.3000 V. Set Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
d In the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop on Neg
Edge 1.
e If the pulse width is outside the limits, adjust the pulse generator channel 2 width and
select the oscilloscope Precision Edge Find until the pulse width is within limits.
2 Check the clock period. Using the oscilloscope, verify that the clock period is 20 ns,
+0 ps or −250 ps.
a In the oscilloscope Timebase menu, select Sweep Speed 4.00 ns/div.
b Select Delay. Using the oscilloscope knob, position the clock waveform so that a
rising edge appears at the left of the display.
3–27
Testing Performance
To test the single-clock, single-edge, state acquisition
c In the oscilloscope Measure menu, select Measure Chan 2, then select Period. If the
period is more than or equal to 20.000 ns, go to step 4. If the period is less than 20.000
ns but greater than 19.75 ns, go to step 3.
d In the oscilloscope Timebase menu, add 10 ns to the delay.
e In the oscilloscope Measure menu, select Period. If the period is more than or equal to
20.000 ns, decrease the pulse generator Chan 2 Doub in 100-ps increments until one of
the two periods measured is less than 20.000 ns but greater than 19.75 ns.
3 Check the data pulse width. Using the oscilloscope, verify that the data pulse width
is 3.50 ns, +0 ps or −100 ps.
a Enable the pulse generator channel 1 and channel 2 outputs. Leave channel 2 output
disabled.
b In the oscilloscope Timebase menu, select Sweep Speed 1.00 ns/div.
c Select Delay. Using the oscilloscope knob, position the data waveform so that the
waveform is centered on the screen.
d In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set Marker
1 at −1.3000 V. Set the Marker 2 Position to Chan 1, then set Marker 2 at −1.3000 V.
e In the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop on Neg
Edge 1.
f Select Precision Edge Find.
g If the pulse width is outside the limits, adjust the pulse generator channel 1 width and
select the oscilloscope Precision Edge Find until the pulse width is within limits.
3–28
Testing Performance
To test the single-clock, single-edge, state acquisition
Check the setup/hold combination
1 Select the logic analyzer setup/hold time.
a In the logic analyzer Format menu, select Master Clock.
b Select the Setup/Hold field, then select the setup/hold combination to be tested for all
pods. The first time through this test, use the top combination in the following table.
Setup/Hold Combinations
3.5/0.0 ns
0.0/3.5 ns
1.5/2.0 ns
c Select Done to exit the setup/hold combinations.
2 Disable the pulse generator channel 2 COMP (with the LED off).
3 Using the Delay mode of the pulse generator channel 1, position the pulses
according to the setup time of the setup/hold combination selected, +0.0 ps or −100
ps.
a In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set
Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
b In the oscilloscope Delta T menu, select Start on Pos Edge 1. Select Stop on Pos
Edge 1.
3–29
Testing Performance
To test the single-clock, single-edge, state acquisition
c Adjust the pulse generator channel 1 Delay, then select Precision Edge Find in the
oscilloscope Delta T menu. Repeat this step until the pulses are aligned according to
the setup time of the setup/hold combination selected, +0.0 ps or −100 ps.
4 Select the clock to be tested.
a In the Master Clock menu, select the clock field to be tested, then select the clock
edge as indicated in the table. The first time through this test, use the top clock and
edge in the following table.
Clocks
J↑
K↑
b Connect the clock to be tested to the pulse generator channel 2 output.
c Select Done to exit the Master Clock menu.
3–30
Testing Performance
To test the single-clock, single-edge, state acquisition
5 Note: This step is only done the first time through the test, to create a Compare file.
For subsequent runs, go to step 6. Use the following to create a Compare file:
a Press Run. The display should show a checkerboard pattern of alternating As and 5s.
Verify the pattern by scrolling through the display.
b Press the List key. In the pop up menu, use the RPG knob to move the cursor to
Compare. Press Select.
c In the Compare menu, move the cursor to Copy Listing to Reference, then select
Execute in the pop-up menu and press the Select key.
d Move the cursor to Specify Stop Measurement and press the Select key. Press Select
again to turn on Compare. At the pop up menu, select Compare. Move the cursor to
the Equal field and press the Select key. At the pop up menu, select Not Equal. Press
Done.
e Move the cursor to the Reference Listing field and select. The field should toggle to
Difference Listing.
6 Press the blue shift key, then press the Run key. If 2 - 4 acquisitions are obtained
without the "Stop Condition Satisfied" message appearing, then the test passes.
Press Stop to halt the acquisition. Record the Pass or Fail results in the
performance test record.
7 Test the next clock.
a Press the Format key, then select Master Clock.
b Turn off and disconnect the clock just tested.
c Repeat steps 4, 6, and 7 for the next clock edge listed in the table in step 4, until all
listed clock edges have been tested.
8 Enable the pulse generator channel 2 COMP (with the LED on).
9 Check the clock pulse width.
a Enable the pulse generator channel 1 and channel 2 outputs.
b In the oscilloscope Timebase menu, select Delay. Using the oscilloscope knob,
position the clock waveform so that the waveform is centered on the screen.
c In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 2, then set
Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
d In the oscilloscope Delta T menu, select Start On Neg Edge 1. Select Stop on Pos
Edge 1.
e If the pulse width is outside the limits, adjust the pulse generator channel 2 width and
select the oscilloscope Precision Edge Find until the pulse width is within limits.
3–31
Testing Performance
To test the single-clock, single-edge, state acquisition
10 Using the Delay mode of the pulse generator channel 1, position the pulses
according to the setup/hold combination selected, +0.0 ps or −100 ps.
a In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set
Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
b In the oscilloscope Delta T menu, select Start on Pos Edge 1. Select Stop on Neg
Edge 1.
c Adjust the pulse generator channel 1 Delay, then select Precision Edge Find in the
oscilloscope Delta T menu. Repeat this step until the pulses are aligned according to
the setup time of the setup/hold combination selected.
11 Select the clock to be tested.
a In the Master Clock menu, select the clock field to be tested, then select the clock
edge as indicated in the table. The first time through this test, use the top clock and
edge.
Clocks
J↓
K↓
b Connect the clock to be tested to the pulse generator channel 2 output.
c Select Done to exit the Master Clock menu (see illustration).
3–32
Testing Performance
12 Press the blue shift key, then press the Run key. If 2 - 4 acquisitions are obtained
without the "Stop Condition Satisfied" message appearing, then the test passes.
Press Stop to halt the acquisition. Record the Pass or Fail results in the
performance test record.
13 Test the next clock.
a Press the Format key, then select Master Clock.
b Turn off and disconnect the clock just tested.
c Repeat steps 11, 12, and 13 for the next clock edge listed in the table in step 10, until
all listed clock edges have been tested.
14 Test the next setup/hold combination.
a In the logic analyzer Format menu, press Master Clock.
b Turn off and disconnect the clock just tested.
c Repeat steps 1 through 14 for the next setup/hold combination listed in step 1 on
page 3–29, until all listed setup/hold combinations have been tested.
When aligning the data and clock waveforms using the oscilloscope, align the waveforms
according to the setup time of the setup/hold combination being tested, +0.0 ps or −100 ps.
3–33
To test the multiple-clock, multiple-edge, state acquisition
Testing the multiple-clock, multiple-edge, state acquisition verifies the performance
of the following specifications:
•
•
•
•
Minimum master to master clock time.
Maximum state acquisition speed.
Setup/Hold time for multiple-clock, multiple-edge, state acquisition.
Minimum clock pulse width.
This test checks data using multiple clocks at three selected setup/hold times.
Equipment Required
Equipment
Critical Specifications
Pulse Generator
Digitizing Oscilloscope
Adapter
SMA Coax Cable (Qty 3)
BNC Cable
Coupler
BNC Test Connector,
6x2 (Qty 4)
100 MHz 3.5 ns pulse width, < 600 ps rise time
≥ 6 GHz bandwidth, < 58 ps rise time
SMA(m)-BNC(f)
18 GHz bandwidth
BNC(m)(m) 48 in. >2 GHz bandwidth
BNC(m)(m)
Recommended
Model/Part
Agilent 8131A option 020
Agilent 54121T
Agilent 1250-1200
Agilent 8120-4948
Agilent 8120-1840
Agilent 1250-0216
Set up the equipment
1 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes before beginning the test if you have not already done so.
2 Set up the pulse generator.
a Set up the pulse generator according to the following table.
Pulse Generator Setup
Channel 1
Channel 2
Period
Delay: 0 ps
Doub: 20.0 ns
40 ns
Width: 4.5 ns
Width: 3.5 ns
High: −0.9 V
High: −0.9 V
Low: −1.7 V
Low: −1.7 V
b Disable the pulse generator channel 2 COMP (with the LED off).
3–34
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
3 Set up the oscilloscope.
Oscilloscope Setup
Time Base
Display
Delta V
Delta T
Time/Div: 1.00 ns/div
avg
V markers on
T markers on
# of avg: 16
marker 1 position: Chan 1
start on: Pos Edge 1
screen: dual
marker 2 position: Chan 1
stop on: Neg Edge 1
Channel
Channel 1
Channel 2
Display
on
on
Probe Atten
20.00
20.00
Offset
−1.3 V
−1.3 V
Volts/Div
400 mV
400 mV
Set up the logic analyzer
1 Set up the Configuration menu.
a Press the Config key.
b Assign all pods to Machine 1. To assign pods, select the pod fields, then select
Machine 1.
c In the Analyzer 1 box, select the Type field, then select State.
3–35
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
2 Set up the Format menu.
a Press the Format key. Select State Acquisition Mode, then select Full Channel/4K
Memory/50MHz.
b Select the field to the right of each Pod field, then select ECL.
3 Set up the Trigger menu.
a Press the Trigger key. Select Clear Trigger, then select All.
b Select the Count Off field, then select Time in the pop-up menu. Select Done to exit
the menu.
c Select the field labeled 1 under the State Sequence Levels. Select the field labeled
"anystate", then select "no state." Select Done to exit the State Sequence Levels menu.
d Select the field next to the pattern recognizer "a," under the label Lab1. Type "000A" ,
then press Select.
3–36
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
Connect the logic analyzer
1 Using the 6-by-2 test connectors, connect the logic analyzer clock and data channels
listed in the following table to the pulse generator. Install a BNC cable between the
pulse generator channel 2 output and the 6x2 test connector with the logic analyzer
clock leads.
2 Using SMA cables, connect channel 1, channel 2, and trigger of the oscilloscope to
the pulse generator.
Connect the 1664A Logic Analyzer to the Pulse Generator
Testing
Combination
Connect to
Agilent 8131A
Channel 1 Output
Connect to
Agilent 8131A
Channel 1 Output
Connect to
Agilent 8131A
Channel 2 Output
1
Pod 1, channel 3
Pod 2, channel 3
Pod 1, channel 11
Pod 2, channel 11
J-clock
K-clock
3 Activate the data channels that are connected according to the previous table.
a Press the Format key.
b Select the field showing the channel assignments for one of the pods being tested.
Press the Clear entry key. Using the arrow keys, move the selector to the data
channels to be tested, then press the Select key. An asterisk means that a channel is
turned on. When all the correct channels of the pod are turned on, press the Done
key. Follow this step for the remaining pods.
3–37
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
c Press the Trigger key. Make sure pattern term a is "A". If not, select the field next to
"a" under the label Lab1. Type "A" then press the Select key.
Verify the test signal
1 Check the clock pulse width. Using the oscilloscope, verify that the clock pulse
width is 3.50 ns, +0 ps or −100 ps.
a Enable the pulse generator channel 1 and channel 2 outputs (with the LED off).
b In the oscilloscope Timebase menu, select Delay. Using the oscilloscope knob,
position the clock waveform so that the waveform is centered on the screen.
c In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 2, then set Marker
1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at −1.3000 V.
d In the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop On Neg
Edge 1.
e If the pulse width is outside of the limits, adjust the pulse generator channel 2 width
and select the oscilloscope Precision Edge Find until the pulse width is within limits.
2 Check the clock period. Using the oscilloscope verify that the clock period is 20 ns,
+0 ps or −250 ps.
a In the oscilloscope Timebase menu, select Sweep Speed 4.00 ns/div.
b Select Delay. Using the oscilloscope knob, position the clock waveform so that a
rising edge appears at the left of the display.
3–38
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
c In the oscilloscope Measure menu, select Measure Chan 2, then select Period. If the
period is more than or equal to 20.000 ns, go to step 4. If the period is less than 20.000
ns but greater than 19.75 ns, go to step 3.
d In the oscilloscope Timebase menu, add 10 ns to the Delay.
e In the oscilloscope Measure menu, select Period. If the period is more than or equal to
20.000 ns, decrease the pulse generator Chan 2 DOUB in 100 ps increments until one
of the two periods measured is less than 20.000 ns but greater than 19.75 ns.
3 Check the data pulse width. Using the oscilloscope verify that the data pulse width
is 4.450 ns, +50 ps or −100 ps.
a In the oscilloscope Timebase menu, select Sweep Speed 1.00 ns/div.
b Select Delay. Using the oscilloscope knob, position the data waveform so that the
waveform is centered in the screen.
c In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set Marker
1 at −1.3000 V. Set the Marker 2 Position to Chan 1, then set Marker 2 at −1.3000 V.
d In the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop on Neg
Edge 1.
e If the pulse width is outside of the limits, adjust the pulse generator channel 1 width
and select the oscilloscope Precision Edge Find until the pulse width is within limits.
3–39
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
Check the setup/hold with single clock edges, multiple clocks
1 Select the logic analyzer setup/hold time.
a In the logic analyzer Format menu, select Master Clock.
b Select and activate any two clock edges.
c Select the Setup/Hold field and select the setup/hold to be tested for all pods. The first
time through this test, use the top combination in the following table.
Setup/Hold Combinations
4.5/0.0 ns
0.0/4.5 ns
2.0/2.5 ns
d Select Done to exit the setup/hold combinations.
2 Disable the pulse generator channel 2 COMP (with the LED off).
3 Using the Delay mode of the pulse generator channel 1, position the pulses
according to the setup time of the setup/hold combination selected, +0.0 ps or −100
ps.
a In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set
Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
b In the oscilloscope Delta T menu, select Start on Pos Edge 1. Select Stop on Pos
Edge 1.
3–40
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
c Adjust the pulse generator channel 1 Delay, then select Precision Edge Find in the
oscilloscope Delta T menu. Repeat this step until the pulses are aligned according to
the setup time of the setup/hold combination selected, +0.0 ps or −100 ps.
4 Select the clocks to be tested.
a Select the clock field to be tested and then select J↑ + K↑ as the clock edges.
b Select Done to exit the Master Clock menu.
3–41
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
5 If you have not already created a Compare file for the previous test (single-clock,
single-edge state acquisition, page 3-31), use the following steps to create one. For
subsequent passes through this test, skip this step and go to step 6.
a Press Run. The display should show a checkerboard pattern of alternating As and 5s.
Verify the pattern by scrolling through the display.
b Press the List key. In the pop up menu, use the RPG knob to move the cursor to
Compare. Press Select.
c In the Compare menu, move the cursor to Copy Listing to Reference, then select
Execute from the pop-up menu and press the Select key.
d Move the cursor to Specify Stop Measurement and press the Select key. Press Select
again to turn on Compare. At the pop up menu, select Compare. Move the cursor to
the Equal field and press the Select key. At the pop up menu, select Not Equal. Press
Done.
e Move the cursor to the Reference Listing field and select. The field should toggle to
Difference Listing.
6 Press the blue shift key, then press the Run key. If 2 - 4 acquisitions are obtained
without the "Stop Condition Satisfied" message appearing, then the test passes.
Press Stop to halt the acquisition. Record the Pass or Fail results in the
performance test record.
7 Enable the pulse generator channel 2 COMP (with the LED on).
8 Check the clock pulse width.
a Enable the pulse generator channel 1 and channel 2 outputs (with the LED off).
b In the oscilloscope Timebase menu, select Delay. Using the oscilloscope knob,
position the clock waveform so that the waveform is centered on the screen.
c In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 2, then set
Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
d In the oscilloscope Delta T menu, select Start On Neg Edge 1. Select Stop On Pos
Edge 1.
e If the pulse width is outside of the limits, adjust the pulse generator channel 2 width
and select the oscilloscope Precision Edge Find until the pulse width is within limits.
3–42
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
9 Using the Delay mode of the pulse generator channel 1, position the pulses
according to the setup time of the setup/hold combination selected, +0.0 ps or −100
ps.
a In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set
Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at
−1.3000 V.
b In the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop on Neg
Edge 1.
c Adjust the pulse generator channel 1 Delay, then select Precision Edge Find in the
oscilloscope Delta T menu. Repeat this step until the pulses are aligned according to
the setup time of the setup/hold combination selected, +0.0 ps or −100 ps.
10 Select the clocks to be tested.
a Select the clock field to be tested, then select J↓ + K↓ as the clock edges.
b Select Done to exit the Master Clock menu.
3–43
Testing Performance
To test the multiple-clock, multiple-edge, state acquisition
11 Press the blue shift key, then press the Run key. If 2 - 4 acquisitions are obtained
without the "Stop Condition Satisfied" message appearing, then the test passes.
Press Stop to halt the acquisition. Record the Pass or Fail results in the
performance test record.
12 Test the next setup/hold combination.
a In the logic analyzer Format menu, select Master Clock.
b Turn off and disconnect the clocks just tested.
c Repeat steps 1 through 12 for the next setup/hold combination listed in step 1 on
page 3-40, until all listed setup/hold combinations have been tested.
When aligning the data and clock waveforms using the oscilloscope, align the waveforms
according to the setup time of the setup/hold combination being tested, +0.0 ps or −100 ps.
hen continue through the complete test.
3–44
To test the single-clock, multiple-edge, state acquisition
Testing the single-clock, multiple-edge, state acquisition verifies the performance of
the following specifications:
• Minimum master to master clock time.
• Maximum state acquisition speed.
• Setup/Hold time for single-clock, multiple-edge, state acquisition.
This test checks data channels using a multiple-edge single clock at three selected
setup/hold times.
Equipment Required
Equipment
Critical Specifications
Pulse Generator
Digitizing Oscilloscope
Adapter
SMA Coax Cable (Qty 3)
BNC Cable
Coupler
BNC Test Connector,
6x2 (Qty 4)
100 MHz 3.5 ns pulse width, < 600 ps rise time
≥ 6 GHz bandwidth, < 58 ps rise time
SMA(m)-BNC(f)
18 GHz bandwidth
BNC(m)(m) 48 in. >2 GHz bandwidth
BNC(m)(m)
Recommended
Model/Part
Agilent 8131A option 020
Agilent 54121T
Agilent 1250-1200
Agilent 8120-4948
Agilent 8120-1840
Agilent 1250-0216
Set up the equipment
1 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes before beginning the test if you have not already done so.
2 Set up the pulse generator according to the following table.
Pulse Generator Setup
Channel 1
Channel 2
Period
Doub: 0 ps
Delay: 0 ps
40 ns
Width: 4.0 ns
Dcyc: 50%
High: −0.9 V
High: −0.9 V
Low: −1.7 V
Low: −1.7 V
COMP: Disabled
(LED off)
COMP: Disabled
(LED off)
3–45
Testing Performance
To test the single-clock, multiple-edge, state acquisition
3 Set up the oscilloscope.
Oscilloscope Setup
Time Base
Display
Delta V
Delta T
Time/Div: 1.00 ns/div
avg
V markers on
T markers on
# of avg: 16
marker 1 position: Chan 1
start on: Neg Edge 1
screen: dual
marker 2 position: Chan 1
stop on: Neg Edge 2
Channel
Channel 1
Channel 2
Display
on
on
Probe Atten
20.00
20.00
Offset
−1.3 V
−1.3 V
Volts/Div
400 mV
400 mV
Set up the logic analyzer
1 Set up the Configuration menu.
a Press the Config key.
b Assign all pods to Machine 1. To assign all pods, select the pod fields, then select
Machine 1.
c Select the Type field in the Analyzer 1 box, then select State.
3–46
Testing Performance
To test the single-clock, multiple-edge, state acquisition
2 Set up the Format menu.
a Press the Format key. Select State Acquisition Mode, then select Full Channel/4K
Memory/50MHz.
b Select the field to the right of each pod field, then select ECL.
3 Set up the Trigger menu.
a Press the Trigger key. Select Clear Trigger, then select All.
b Select the Count Off field, then select Time in the pop-up menu. Select Done to exit
the menu.
c Select the field labeled 1 under the State Sequence Levels. Select the field labeled
"anystate", then select "no state." Select Done to exit the State Sequence Levels menu.
d Select the field next to the pattern recognizer "a," under the label Lab1. Type "000A" ,
then press Select.
3–47
Testing Performance
To test the single-clock, multiple-edge, state acquisition
Connect the logic analyzer
1 Using the 6-by-2 test connectors, connect the logic analyzer clock and data channels
listed in the following table to the pulse generator. Install a BNC cable between the
pulse generator channel 2 output and the 6x2 test connector with the logic analyzer
clock leads.
2 Using SMA cables, connect channel 1, channel 2, and trigger of the oscilloscope to
the pulse generator.
Connect the 1664A Logic Analyzer to the Pulse Generator
Testing
Combination
Connect to
Agilent 8131A
Channel 1 Output
Connect to
Agilent 8131A
Channel 1 Output
Connect to
Agilent 8131A
Channel 2 Output
1
Pod 1, channel 3
Pod 2, channel 3
Pod 1, channel 11
Pod 2, channel 11
J-clock
3 Activate the data channels that are connected according to the previous tables.
a Press the Format key.
b Select the field showing the channel assignments for one of the pods being tested.
Press the Clear entry key. Using the arrow keys, move the selector to the data
channels to be tested, then press the Select key. An asterisk means that a channel is
turned on. When all the correct channels of the pod are turned on, press the Done
key. Follow this step for the remaining pods.
3–48
Testing Performance
To test the single-clock, multiple-edge, state acquisition
c Press the Trigger key. Make sure pattern term a is "A". If not, select the field next to
"a" under the label Lab1. Type "A" then press the Select key.
Verify the test signal
1 Check the clock period. Using the oscilloscope, verify that the clock period is 20 ns,
+0 ps or −250 ps.
a In the oscilloscope Timebase menu, select Sweep Speed 4.00 ns/div.
b Select Delay. Using the oscilloscope knob, position the clock waveform (Channel 2)
so that a rising edge appears at the left of the display.
c In the oscilloscope Measure menu, select Measure Chan 2, then select +Width. If the
positive-going pulse width is more than 20.000 ns, go to step d. If the pulse width is
less than or equal to 20.000 ns, go to step 2.
d In the oscilloscope Measure menu, select -Width. If the negative-going pulse width is
less than or equal to 20.000 ns but greater than 19.75 ns, go to step 2.
e Decrease the pulse generator Period in 100 ps increments until the oscilloscope
Measure +Width or Measure -Width reads less than or equal to 20.000 ns, but greater
than 19.75 ns.
3–49
Testing Performance
To test the single-clock, multiple-edge, state acquisition
2 Check the data pulse width. Using the oscilloscope, verify that the data pulse width
is 4.000 ns, +0 ps or −100 ps.
a In the oscilloscope Timebase menu, select Sweep Speed 1.00 ns/div.
b Select Delay. Using the oscilloscope knob, position the data waveform (Channel 1) so
that the waveform is centered on the screen.
c In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set Marker
1 at −1.3000 V. Set the Marker 2 Position to Chan 1, then set Marker 2 at −1.3000 V.
d In the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop on Neg
Edge 1. Select Precision Edge Find.
e If the pulse width is outside of the limits, adjust the pulse generator channel 1 width
and select the oscilloscope Precision Edge Find until the pulse width is within limits.
3–50
Testing Performance
To test the single-clock, multiple-edge, state acquisition
Check the setup/hold combination
1 Select the logic analyzer setup/hold time.
a In the logic analyzer Format menu, select Master Clock.
NOTE
The first time through this test, assign the clocks according to the first testing combination in
step 3 of these procedures.
b In the Master Clock menu, select Setup/Hold.
c In the Setup/Hold menu, select the setup/hold field, then select for all pods the
setup/hold combination to be tested. The first time through this test, use the top
combination in the following table.
Setup/Hold Combinations
4.0/0.0 ns
0.0/4.0 ns
2.0/2.0 ns
d Select Done to exit the setup/hold combinations.
2 Using the Delay mode of the pulse generator Channel 2, position the pulses
according to the setup time of the setup/hold combination selected, +0.0 ps or
-100.0 ps.
a In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set Marker
1 at -1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at -1.3000 V.
b In the oscilloscope Delta T menu, select Start on Pos Edge 1. Select Stop on Pos
Edge 1. Select Precision Edge Find.
3–51
Testing Performance
To test the single-clock, multiple-edge, state acquisition
c Adjust the pulse generator channel 2 Delay, then select Precision Edge Find in the
oscilloscope Delta T menu. Repeat this step until the pulses are aligned according to
the setup time of the setup/hold combination selected, +0.0 ps or −100 ps.
NOTE
If the rising clock edge does not appear on the oscilloscope display, then add 20.0 ns to the
oscilloscope Timebase Delay.
3 Select the clock to be tested.
a In the Master Clock menu, select the clock field to be tested, then select the clock
edge as indicated in the table. The first time through this test, use the top clock and
edge in the following table.
Clocks
J↕
K↕
b Select Done to exit the Master Clock menu.
4 If a Compare file was not created during the single-clock, single-edge test, then the
first time through this test, create a Compare file.
a Press Run. The display should show a checkerboard pattern of alternating A and 5.
Scroll through the display to verify.
b Press the List key. In the pop up menu, use the RPG knob to move the cursor to
Compare. Press Select.
c In the Compare menu, move the cursor to Copy Listing to Reference, then press the
Select key.
d Move the cursor to Specify Stop Measurement and press the Select key. Press Select
again to turn on Compare. At the pop up menu, select Compare. Move the cursor to
the Equal field and press the Select key. At the pop up menu, select Not Equal. Press
Done.
e Move the cursor to the Reference Listing field and select. The field should toggle to
Difference Listing.
5 Press the blue shift key, then press the Run key. If 2 - 4 acquisitions are obtained
without the "Stop Condition Satisfied" message appearing, then the test passes.
Press Stop to halt the acquisition. Record the Pass or Fail results in the
performance test record.
3–52
Testing Performance
To test the single-clock, multiple-edge, state acquisition
6 Test the next clock.
a Press the Format key, then select Master Clock.
b Turn off and disconnect the clock just tested.
c Repeat steps 3 and 5 for the next clock listed in the table in step 3, until all listed clock
edges have been tested.
7 Test the next setup/hold combination. a Press the Format key, then select Master
Clock and turn off the clock just tested. b Repeat steps 1 through 7 for the next
setup/hold combination listed in step 1, until all listed setup/hold combinations have
been tested.
When aligning the data and clock waveforms using the oscilloscope, align the waveforms
according to the setup time of the setup/hold combination being tested, +0.0 ps or -100.0 ps.
3–53
To test the time interval accuracy
Testing the time interval accuracy does not check a specification, but does check the
following:
• 125 MHz oscillator
This test verifies that the 125 MHz timing acquisition synchronizing oscillator is
operating within limits.
Equipment Required
Equipment
Critical Specifications
Recommended
Model/Part
Pulse Generator
100 MHz 3.5 ns pulse width, < 600 ps rise time
Agilent 8131A Option 020
−6
Function Generator
Accuracy ≤ (5)(10 ) × frequency
SMA Cable
Agilent 3325B Option 002
Agilent 8120-4948
Adapter
BNC(m)-SMA(f)
Agilent 1250-2015
BNC Test Connector,
6x2
Set up the equipment
1 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes if you have not already done so.
2 Set up the pulse generator according to the following table.
Pulse Generator Setup
Channel 1
Period
Mode
EXT TRIG
Delay: 0 ps
5 us
TRIG
Slope: Positive
Width: 2.5 us
High: −0.9 V
Low: −1.7 V
COMP: Disabled
(LED off)
3–54
THRE: 1.0 V
Testing Performance
To test the time interval accuracy
3 Set up the function generator according to the following table.
Function Generator Setup
Freq: 200 000 . 0 Hz
Main Function: Square wave
Amptd: 3.000 V
High Voltage: Disabled (LED Off)
Phase: 0.0 deg
DC Offset: 0.0 V
Set up the logic analyzer
1 Set up the Configuration menu.
a Press the Config key.
b In the Configuration menu, assign Pod 1 to Machine 1. To assign Pod 1, select the
Pod 1 field, then select Machine 1.
c In the Analyzer 1 box, select the Type field, then select Timing.
3–55
Testing Performance
To test the time interval accuracy
2 Set up the Format menu.
a Press the Format key. Select Timing Acquisition Mode, then select Transitional Full
Channel 125 MHz.
b Select the field to the right of the Pod 1 field, then select ECL.
c Select the field showing the channel assignments for Pod 1. Deactivate all channels by
pressing the Clear entry key. Using the arrow keys, move the selector to Channel 0.
Press the Select key to put an asterisk in the channel position, activating the channel,
then press the Done key.
3 Press the Trigger key. Select Modify Trigger, then Clear Trigger and All from the
pop-up menus.
3–56
Testing Performance
To test the time interval accuracy
4 Set up the Waveform menu.
a Press the Waveform key.
b Move the cursor to the sec/Div field, then use the RPG knob to dial in 2.00 µs.
c Select the Markers Off field, then select Pattern.
d Select the Specify Patterns field. Select X entering 1 and O entering 1.
e
f
g
h
Select Done to exit the Specify Patterns menu.
Move the cursor to the X-pat field. Type 1, then press Done.
Move the cursor to the O-pat field. Type 20, then press Done.
Select the Markers Patterns field, then select Statistics. Select Reset Statistics to
initialize the statistics fields.
Connect the logic analyzer
1 Using a 6-by-2 test connector, connect channel 0 of Pod 1 to the pulse generator
channel 1 output.
2 Using the SMA cable and the BNC adapter, connect the External Input of the pulse
generator to the Main Signal of the function generator.
3–57
Testing Performance
To test the time interval accuracy
Acquire the data
1 Enable the pulse generator channel 1 output (with the LED off).
2 Press the blue key, then press the Run key to select Run-Repetitive. Allow the logic
analyzer to acquire data for at least 100 valid runs as indicated in the pattern
statistics field.
3 When the logic analyzer has acquired at least 100 valid runs, touch Stop. The
Min X-O field in the logic analyzer Pattern Statistics menu should read
94.99–95.00 µs. The Max X-O field should read 95.00–95.01 µs. The Avg X-O field
should read 94.99–95.01 µs. Record the results in the performance test record.
3–58
Performance Test Record
Performance Test Record
1664A Logic Analyzer_______
Serial No.______________________
Work Order No.___________________
Recommended Test Interval - 2 Year/4000 hours
Date___________________
Recommended next testing___________________
Temperature___________________
Test
Settings
Results
Pass/Fail
________
Limits
Measured
TTL VL
TTL VH
ECL VL
ECL VH
-User VL
- User VH
+ User VL
+ User VH
0 V User VL
0 V User VH
+1.355 V
+1.645 V
-1.439 V
-1.161 V
-6.280 V
-5.720 V
+5.720 V
+6.280 V
-100 mV
+100 mV
________
________
________
________
________
________
________
________
________
________
TTL VL
TTL VH
ECL VL
ECL VH
-User VL
- User VH
+ User VL
+ User VH
0 V User VL
0 V User VH
+1.355 V
+1.645 V
-1.439 V
-1.161 V
-6.280 V
-5.720 V
+5.720 V
+6.280 V
-100 mV
+100 mV
________
________
________
________
________
________
________
________
________
________
Self-Tests
Threshold
Accuracy
Pod 1
± (100 mV + 3% of
threshold setting)
TTL, ±145 mV
ECL, ±139 mV
-User, ±280 mV
+User, ±280 mV
0 V, ±100 mV
Pod 2
TTL, ±145 mV
ECL, ±139 mV
-User, ±280 mV
+User, ±280 mV
0 V, ±100 mV
Glitch Capture
Minimum Detectable
Glitch 3.5 ns
Pass/Fail
Pod 1
________
Pod 2
________
3–59
Performance Test Record (continued)
Test
Settings
Results
Pass/Fail
Single-Clock,
Single-Edge
Acquisition
Pass/Fail
Setup/Hold Time
3.5/0.0 ns
J↑
K↑
________
________
J↓
K↓
________
________
Setup/Hold Time
0.0/3.5 ns
J↑
K↑
________
________
J↓
K↓
________
________
Setup/Hold Time
1.5/2.5 ns
J↑
K↑
________
________
J↓
K↓
________
________
Multiple-Clock,
Multiple-Edge
Acquisition
Pass/Fail
Pass/Fail
Setup/Hold Time
4.5/0.0 ns
J↑ + K↑
________
JÅ + K↓
________
Setup/Hold Time
0.0/4.5 ns
J↑ + K↑
________
JÅ + K↓
________
Setup/Hold Time
2.0/2.5 ns
J↑ + K↑
________
JÅ + K↓
________
Single-Clock,
Multiple-Edge
Acquisition
Pass/Fail
Setup/Hold Time
4.0/0.0 ns
J↕
K↕
_______
_______
Setup/Hold Time
0.0/4.0 ns
J↕
K↕
_______
_______
Setup/Hold Time
2.0/2.0 ns
J↕
K↕
_______
_______
Measured
Time Interval
Accuracy
min X-0
94.99-95.00 µs
_________
max X-0
95.00-95.01 µs
_________
avg X-0
94.99-95.01 µs
_________
3–60
4
Logic analyzer calibration 4-2
To adjust the CRT monitor alignment 4-3
To adjust the CRT intensity 4-5
Calibrating and Adjusting
Calibrating and Adjusting
This chapter gives you instructions for calibrating and adjusting the logic analyzer.
Adjustments to the logic analyzer include adjusting the CRT monitor assembly.
To periodically verify the performance of the analyzer, refer to "Testing Performance"
in chapter 3.
Logic analyzer calibration
The logic analyzer circuitry of the 1664A Logic Analyzer does not require an
operational accuracy calibration. To test the logic analyzer circuitry against
specifications (full calibration), refer to chapter 3, Testing Performance.
Set up the equipment
Turn on the logic analyzer. Let it warm up for 30 minutes if you have not already done so.
4–2
To adjust the CRT monitor alignment
WARNING
Do not touch the CRT monitor sweep board. High voltages exist on the sweep board that can
cause personal injury.
Equipment Required
Equipment
Critical Specification
Recommended
Model/Part
Alignment Tool
1
8710-1300
1 Turn off the logic analyzer, then disconnect the power cord. Remove the cover.
Refer to chapter 6, "Replacing Assemblies," for instructions to remove the cover.
2 Connect the power cord, insert the operating system disk into the disk drive, then
turn on the logic analyzer.
3 Insert the disk containing the functional performance verification tests (normally
the same disk) into the disk drive, then load the functional performance verification
operating system into the logic analyzer (refer to Chapter 3, To Perform Self Tests).
4–3
Calibrating and Adjusting
To adjust the CRT monitor alignment
4 Enter the Sys PV tests, then enter the Display Test.
A grid pattern should appear.
5 If the display is tilted (rotated), adjust the CRT yoke by rotating it to straighten the
display.
Yoke
6 If the grid pattern is not centered horizontally, adjust the H-Hold.
7 If you need to adjust the intensity, go to the next page.
If you are finished with the adjustments, turn off the instrument, then remove the
power cord. Install the cover on the instrument.
4–4
To adjust the CRT intensity
WARNING
Do not touch the CRT monitor sweep board. High voltages exist on the sweep board that can
cause personal injury.
Equipment Required
Equipment
Critical Specification
Recommended
Model/Part
Alignment Tool
1
8710-1300
Light Power Meter
United Detector 351
1 Turn off the logic analyzer, then disconnect the power cord. Remove the cover.
Refer to chapter 6, "Replacing Assemblies," for instructions to remove the cover.
2 Connect the power cord, insert the operating system disk, then turn on the logic
analyzer.
3 Access the Display Test.
• If you just finished adjusting the CRT monitor alignment, go to step 4.
• To Access the Display Test, perform the following steps.
a Insert the disk containing the functional performance verification tests (normally the
same disk) into the disk drive, then load the functional performance verification
operating system into the logic analyzer (refer to Chapter 3, To Perform The Self
Tests).
b Enter the Sys PV tests and enter the Display Test. A grid pattern should appear.
4 Press the front panel Select key.
The display should show a full bright test screen.
5 Turn the rear panel intensity adjustment to full bright.
6 Place the light power meter against the display at center screen.
4–5
Calibrating and Adjusting
To adjust the CRT intensity
WARNING
Do not touch the CRT monitor sweep board. High voltages exist on the sweep board that can
cause personal injury.
2
7 The light power meter should read 137-154 cd/m . If the measurement is out of this
range, use the adjustment tool to adjust the Contrast potentiometer on the monitor
driver board.
8 Press the front panel Select key.
The display should show a half bright test screen.
9 Place the light power meter against the display at center screen. The light power
meter should read 5-27 cd/m2.
If the reading is not correct, try adjusting the contrast in step 7 closer to the limit.
10 Press the front panel Select key.
The logic analyzer should exit the Display Test.
11 Place the light power meter against the display at center screen. Adjust the rear
panel intensity adjustment until the light power meter reads 45-55 cd/m2.
12 Exit the functional performance verification tests.
13 Turn off the instrument, then remove the power cord. Install the cover on the
instrument.
4–6
5
To use the flowcharts 5-2
To check the power-up tests 5-15
To run the self-tests 5-16
To test the power supply voltages 5-21
To test the CRT monitor signals 5-23
To test the keyboard signals 5-24
To test the disk drive voltages 5-25
To perform the BNC test 5-27
To test the logic analyzer probe cables 5-28
To test the auxiliary power 5-32
Troubleshooting
Troubleshooting
This chapter helps you troubleshoot the logic analyzer to find defective assemblies.
The troubleshooting consists of flowcharts, self-test instructions, and tests. This
information is not intended for component-level repair.
If you suspect a problem, start at the top of the first flowchart. During the
troubleshooting instructions, the flowcharts will direct you to perform other tests.
The service strategy for this instrument is the replacement of defective assemblies.
This instrument can be returned to Agilent Technologies for all service work,
including troubleshooting. Contact your nearest Agilent Technologies Sales Office for
more details.
CAUTION
Electrostatic discharge can damage electronic components. Use grounded wriststraps and
mats when you perform any service to this instrument or to the cards in it.
To use the flowcharts
Flowcharts are the primary tool used to isolate defective assemblies. The flowcharts refer to
other tests to help isolate the trouble. The circled letters on the charts indicate connections
with the other flowcharts. Start your troubleshooting at the top of the first flowchart.
5–2
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 1
5–3
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 2
5–4
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 3
5–5
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 4
5–6
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 5
5–7
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 6
5–8
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 7
5–9
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 8
5–10
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 9
5–11
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 10
5–12
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 11
5–13
Troubleshooting
To use the flowcharts
Troubleshooting Flowchart 12
5–14
Troubleshooting
To check the power-up tests
To check the power-up tests
The logic analyzer automatically performs power-up tests when you apply power to the
instrument (during the boot-up sequence). The revision number of the operating system
shows in the upper-right corner of the screen during these power-up tests. As each test
completes, either "passed" or "failed" prints on the screen in front of the name of each test.
1 Disconnect all inputs, then insert the operating system disk into the disk drive.
2 Let the instrument warm up for a few minutes, then cycle power by turning off then
turning on the power switch.
If the instrument is not warmed up, the power-up test screen will complete before you can
view the screen.
3 As the tests complete, check if they pass or fail.
Performing Power-Up Self-Tests
passed
ROM text
passed
RAM test
passed
Interrupt test
passed
Display test
passed
HIL Controller test
passed
HIL Devices test
No Disk
Front Disk test
5–15
Troubleshooting
To run the self-tests
To run the self-tests
Self-tests identify the correct operation of major functional areas of the instrument. You can
run all self-tests without accessing the interior of the instrument. If a self-test fails, the
troubleshooting flowcharts instruct you to change a part of the instrument.
1 If you just did the power-up self-tests, go to step 2.
If you did not just do the power-up self-tests, disconnect all inputs, insert the
operating system disk, then turn on the power switch. Wait until the power-up tests
are complete.
2 Press the System key, then select the field next to System. Select Test in the pop-up
menu and then press the Select key.
3 Select the box labeled Load Test System then press the select key. Insert the disk
containing the performance verification tests (self-tests) into the disk drive
(normally the same as the boot disk).
4 Select the box labeled Continue and press the Select key. After the test files have
been loaded, and Analy menu is displayed.
You can run all the analyzer tests at one time by selecting All Analyzer Tests. To see more
details about each test, you can run each test individually.
5 Select the Chip 5 Tests menu and press the Select key.
5–16
Troubleshooting
To run the self-tests
6 Select Run, then select Single. The test runs one time, then the screen shows the
results. When the test is finished, select Done.
To run a test continuously, select Repetitive. Select Stop to halt a Run Repetitive.
7 Select Board Tests, then select Run. When the Board Tests are finished, select Done.
8 Select Data Input Inspection. All lines should show activity. Select Done to exit the
Data Input Inspection.
9 Select Analy PV, then select Sys PV PV in the pop up menu and press the Select key.
5–17
Troubleshooting
To run the self-tests
10 Select the Printer/Controller field next to Sys PV. Select System Test and press the
Select key to access the system tests.
You can run all tests at one time by running All System Tests. To see more details about each
test, you can run each test individually. This example shows how to run an individual test.
11 Select ROM Test. The ROM Test screen is displayed.
12 Select Run, then select Single.
To run a test continuously, select Repetitive. Select Stop to halt a repetitive test.
5–18
Troubleshooting
To run the self-tests
For a Single run, the test runs one time, and the screen shows the results.
13 To exit the ROM Test, select Done. Note that the status changes to Passed or Failed.
14 Install a formatted disk that is not write protected into the disk drive. If option 020
is installed, connect an RS-232C loopback connector onto the RS-232C port. Run the
remaining System Tests in the same manner.
If option 020 is not installed in the 1664A, the RS-232C test will return a FAILED status.
15 Select the Front Panel Test.
A screen duplicating the front-panel appears on the screen.
a Press each key on the front panel. The corresponding key on the screen will change
from a light to a dark color.
b Test the knob by turning it in both directions.
c Note any failures, then press the Done key a second time to exit the Front Panel Test.
The test screen shows the Front Panel Test status changed to Tested.
16 Select the Display Test.
A white grid pattern is displayed. These display screens can be used to adjust the display.
a Select Continue and the screen changes to full bright.
b Select Continue and the screen changes to half bright.
c Select Continue and the test screen shows the Display Test status changed to Tested.
5–19
Troubleshooting
To run the self-tests
17 To exit the tests, press the System key, then select Exit Test in the pop-up menu
and press the select key. Reinstall the disk containing the operating system, then
select Exit Test System and press the select key.
If you are performing the self-tests as part of the troubleshooting flowchart, return to the
flowchart.
5–20
Troubleshooting
To test the power supply voltages
To test the power supply voltages
To check the voltages, the power supply must be loaded by either the acquisition board or
with an added resistor.
Refer to chapter 6, "Replacing Assemblies," for instructions to remove or replace covers and
assemblies.
WARNING
Hazard voltages exist on the power supply, the CRT, and the CRT driver board. This
procedure is to be performed by service-trained personnel aware of the hazards involved,
such as fire and electrical shock.
Loaded by the acquisition board
1 Turn off the instrument, then remove the power cable. Remove the cover of the
instrument.
2 Connect the power plug, then turn on the instrument.
3 Check for the +5 V, as indicated by the figure below.
Loaded by the added resistor
1 Turn off the instrument, then remove the power cable. Remove the cover of the
instrument and the disk drive assembly.
2 Remove the power supply far enough to disconnect the power supply cable from the
acquisition board. Bring the end of the cable up and out of the instrument.
Use the disconnected cable to load the supply and to make measurements.
3 Load the +5.00 V supply with a 2 Ω, 25 watt resistor.
a With a jumper wire, connect one end of the resistor to one of the 5.00 V pins (pins 1
through 4) on the supply cable.
b With another jumper wire, connect the other end of the resistor to one of the ground
pins (pins 5 through 7) on the supply cable.
4 Connect the power plug, then turn on the instrument.
5 Check for the +5 V as indicated by the figure below.
5–21
Troubleshooting
To test the power supply voltages
6 Check for the voltages on the power supply cable using the values in the following
table.
Signals on the Power Supply Cable
Pin
Signal
Pin
Signal
1
+5.00 V
11
–5.20 V
2
+5.00 V
12
Ground
3
+5.00 V
13
+12 V
4
+5.00 V
14
Ground
5
Ground (Digital)
15
–12 V
6
Ground (Digital)
16
Ground
7
Ground (Digital)
17
+12 V (Display)
8
Ground (Display)
18
–5.20 V
9
+3.50 V
19
+15 V (Fan)
10
Ground
20
Ground (Fan)
5–22
Troubleshooting
To test the CRT monitor signals
To test the CRT monitor signals
Refer to chapter 6, "Replacing Assemblies," for instructions to remove or replace covers and
assemblies.
WARNING
Hazard voltages exist on the power supply, the CRT, and the CRT driver board. This
procedure is to be performed by service-trained personnel aware of the hazards involved,
such as fire and electrical shock.
1 Remove the cover of the instrument.
2 Check the CRT monitor input cable for the signals and the power supplies listed in
the table below. The cable is the wide ribbon cable connecting the monitor to the
acquisition board.
CRT Monitor Cable Signals
Pin
Signal
Pin
Signal
1
NC
2
+12 V
3
Ground
4
Ground
5
+12 V
6
Ground
7
+12 V
8
Ground
9
+12 V
10
HSYNC
11
VSYNC
12
+12 V
13
Ground
14
Ground
15
Ground
16
Video
17
Ground
18
NC
19
Ground
20
NC
5–23
Troubleshooting
To test the keyboard signals
To test the keyboard signals
Refer to chapter 6, "Replacing Assemblies," for instructions to remove covers and assemblies.
WARNING
Hazard voltages exist on the power supply, the CRT, and the CRT driver board. This
procedure is to be performed by service-trained personnel aware of the hazards involved,
such as fire and electrical shock.
1 Turn off the instrument and remove the power cable.
2 Without disconnecting the keyboard cable, follow the keyboard removal procedure
to loosen the keyboard. Leave the keyboard in place in front of the instrument.
3 Reconnect the power cable, install the operating system disk, then turn on the
instrument.
4 Run the Front Panel Test, pressing all of the keys.
5 If a random key is not operating, then go to the next step.
If a group of keys do not work, then check the keyboard voltages and signals.
Keyboard Connector Signals
Pin
Signal
Pin
Signal
1
Keyboard Return
13
Keyboard Scan
2
"
14
"
3
"
15
"
4
"
16
"
5
"
17
"
6
"
18
"
7
"
19
LED
8
"
20
+5 V
9
Keyboard Scan
21
Ground
10
"
22
Knob
11
"
23
Ground
12
"
24
Knob
6 Allow the keyboard assembly to fall forward from the front panel. Separate the
elastomeric keypad and keyboard panel from the PC board.
7 Using a paper clip or screwdriver, short the PC board trace of the non-operating key
and look for an appropriate response on the display.
8 If the display responds as if the key were pressed, replace the elastomeric keypad.
If the display does not respond as if the key were pressed, replace the keyboard.
9 Check the RPG connector.
The RPG connector has a TTL pulse on pins 22 and 24 when the knob is being turned. Pin 20
of the connector is +5 V.
5–24
Troubleshooting
To test the disk drive voltages
To test the disk drive voltages
Refer to chapter 6, "Replacing Assemblies," for instructions to remove or replace covers and
assemblies.
WARNING
This procedure is to be performed by service-trained personnel aware of the hazards
involved, such as fire and electrical shock.
Equipment Required
Equipment
Critical Specification
Recommended
Model/Part
Digitizing Oscilloscope
> 100 MHz Bandwidth
Agilent 54600A
1 Turn off the instrument, then remove the power cable. Remove the instrument
cover and the disk drive.
2 Reconnect the disk drive cable to the rear of the disk drive. Turn the disk drive over
so that the solder connections of the cable socket are accessible.
3 Connect the power cable, insert the operating system disk, then turn on the
instrument.
4 Insert the disk that contains the functional performance verification software and
enter the test operating system.
5 In the Sys PV menu select the Disk test. Insert a disk that has enough available
bytes to run the test in the disk drive, then select Run-Repetitive.
5–25
Troubleshooting
To test the disk drive voltages
6 Check for the following voltages and signals using an oscilloscope.
Disk Drive Voltages
Pin
Signal Description
Pin
Signal Description
1
NC
2
Disk Change
3
NC
4
High Density
5
NC
6
NC
7
+5 V
8
Index
9
+5 V
10
Drive Select
11
+5 V
12
NC
13
Ground
14
NC
15
Ground
16
Motor On
17
Ground
18
Direction
19
Ground
20
Step
21
Ground
22
Write Data
23
Ground
24
Write Gate
25
Ground
26
Track 00
27
Ground
28
Write Protect
29
Ground
30
Read Data
31
Ground
32
Side Select
33
Ground
34
Ready
7 Select Stop, and turn off the logic analyzer. Remove the power cable.
8 Disconnect the disk drive cable and re-install the disk drive in the logic analyzer.
9 Reconnect the disk drive cable and install the cover on the logic analyzer.
5–26
Troubleshooting
To perform the BNC test
To perform the BNC test
Equipment Required
Equipment
Critical Specification
Recommended
Model/Part
Digitizing Oscilloscope
100 MHz Bandwidth
Agilent 54600A
BNC Shorting Cap
1250-0074
BNC Cable
Agilent 10503A
BNC-Banana Adapter
1251-2277
1 Press the Config key.
2 Assign pods 1 and 2 to Machine 1.
To assign the pod field, select the pods 1 and 2 field, then select Machine 1 in the pop-up
menu.
3 In the Analyzer 1 box, select the Type field. Select Timing in the pop-up menu.
4 Set up the trigger menu.
a Press the Trig key. Select Clear Trigger All.
b Select Arming Control. In the Arming Control pop-up menu, select the field labeled
Run, then select Port In. Press the Done key.
5 Attach a BNC shorting cap to the External Trigger Input on the rear panel of the
logic analyzer.
6 Using a BNC cable, connect the External Trigger output to the oscilloscope
channel 1 input. Set the oscilloscope to Trigger On and measure TTL voltage levels.
7 Press the RUN front panel key.
The warning "MACHINE 1 Waiting on level 1" will appear.
8 Remove the shorting cap from the rear panel External Trigger input BNC.
9 The warning will go away and the oscilloscope will display a positive-going TTL
pulse.
5–27
Troubleshooting
To test the logic analyzer probe cables
To test the logic analyzer probe cables
This test allows you to functionally verify the probe cable and probe tip assembly of any of the
logic analyzer pods. Only one probe cable can be tested at a time. Repeat this test for each
probe cable to be tested.
Equipment Required
Equipment
Critical Specification
Recommended
Model/Part
Pulse Generator
100 MHz, 3.5 ns pulse width,
< 600 ps rise time
Agilent 8131A Option 020
Adapter (Qty 4)
SMA (m) - BNC (f)
Agilent 1250-1200
Coupler (Qty 4)
BNC (m)(m)
Agilent 1250-0216
6x2 Test Connectors (Qty 4)
1 Turn on the equipment required. Insert the operating system disk and turn on the
logic analyzer.
2 Set up the pulse generator.
a Set up the pulse generator according to the following table.
Pulse Generator Setup
Channel 1
Channel 2
Period
Delay: 0 ps
Delay: 0 ps
100 ns
Dty: 50%
Dty: 50%
High: 3.00 V
High: 3.00 V
Low: 0.00 V
Low: 0.00 V
b Enable the pulse generator channel 1 and channel 2 outputs (with the LEDs off).
3 Set up the logic analyzer Configuration menu.
a Press the Config key.
b In the Analyzer 1 box, select the field to the right of Type, then select State.
5–28
Troubleshooting
To test the logic analyzer probe cables
4 Set up the Format menu.
a Press the Format key.
b Move the cursor to the field showing the channel assignments for the pod under test.
Press the Clear Entry key until the pod channels are all assigned (all asterisks (*)).
Press the Done key.
c Select Master Clock, then select a double edge for the clock of the pod under test.
Turn off the other clocks.
d In the Master Clock menu, select Setup/Hold, then select 4.0/0.0 ns for the pod being
tested. Select Done. Select Done again to exit the Master Clock menu.
5–29
Troubleshooting
To test the logic analyzer probe cables
e Select the field to the right of the pod being tested, then select TTL.
5 Set up the Trigger menu.
a Press the Trigger key.
b Select Clear Trigger, then select All.
6 Set up the Listing menu.
a Press the List key.
b Select the field to the right of Base, then select Binary.
5–30
Troubleshooting
To test the logic analyzer probe cables
7 Using four 6-by-2 test connectors, four BNC Couplers, and four SMA (m) - BNC (f)
Adapters, connect the logic analyzer to the pulse generator channel outputs. To
make the test connectors, see chapter 3, "Testing Performance."
a Connect the even-numbered channels of the lower byte of the pod under test to the
pulse generator channel 1 Output and J-clock.
b Connect the odd-numbered channels of the lower byte of the pod under test to the
pulse generator channel 1 Output.
c Connect the even-numbered channels of the upper byte of the pod under test and the
clock channel to the pulse generator channel 2 Output.
d Connect the odd-numbered channels of the upper byte of the pod under test to the
pulse generator channel 2 Output.
8 On the logic analyzer, press Run. The display should look similar to the figure below.
9 If the display looks like the figure, then the cable passed the test.
If the display does not look similar to the figure, then there is a possible problem
with the cable or probe tip assembly. Causes for cable test failures include the
following:
• open channel.
• channel shorted to a neighboring channel.
• channel shorted to either ground or a supply voltage.
Return to the troubleshooting flowchart.
5–31
Troubleshooting
To test the auxiliary power
To test the auxiliary power
The +5 V auxiliary power is protected by a current overload protection device. If the current
on pins 1 and 39 exceed 0.33 amps, the circuit will open. When the short is removed, the
circuit will reset in approximately 1 minute. There should be +5 V after the 1 minute reset
time.
Equipment Required
Equipment
Critical Specifications
Recommended
Model/Part
Digital Multimeter
0.1 mV resolution, better than Agilent 3478A
0.005% accuracy
• Using the multimeter, verify the +5 V on pins 1 and 39 of the probe cables.
5–32
6
To remove and replace the
Handle 6-5
Feet and tilt stand 6-5
Cover 6-5
Disk drive 6-6
Power supply 6-7
Main circuit board 6-7
Switch actuator assembly 6-8
Rear panel assembly 6-9
Front panel and keyboard 6-10
Intensity adjustment 6-10
Monitor 6-11
Handle plate 6-11
Fan 6-12
Line filter 6-12
Optional GPIB and/or RS-232C cables 6-13
To return assemblies 6-14
Replacing Assemblies
Replacing Assemblies
This chapter contains the instructions for removing and replacing the assemblies of
the logic analyzer. Also in this chapter are instructions for returning assemblies.
WARNING
CAUTION
Hazardous voltages exist on the power supply, the CRT, and the CRT driver board. To avoid
electrical shock, disconnect the power from the instrument before performing the following
procedures. After disconnecting the power, wait at least three minutes for the capacitors on
the power supply board and the CRT driver board to discharge before servicing the
instrument.
Damage can occur to electronic components if you remove or replace assemblies when the
instrument is on or when the power cable is connected. Never attempt to remove or install
any assembly with the instrument on or with the power cable connected.
Replacement Strategy
These replacement procedures are organized as if disassembling the complete
instrument, from the first assembly to be removed to the last. Some procedures say
to remove other assemblies of the instrument, but do not give complete instructions.
Refer to the procedure for that specific assembly for the instructions. Use the
exploded view of the instrument on the next page as a reference during the
replacement procedures.
CAUTION
Electrostatic discharge can damage electronic components. Use grounded wriststraps and
mats when performing any service to this logic analyzer.
Tools Required
#10 TORX screwdriver
#15 TORX screwdriver
#1 Posidrive screwdriver
3/16 inch (5 mm) nut driver
9/32 inch (7 mm) nut driver
6–2
Replacing Assemblies
Exploded View
Listing
A1
A2
A3
A4
A5
Main circuit board
Keyboard
Switch actuator
Probe cable
Probe tip
MP3
MP4
MP5
MP6
MP7
Fan guard
Rear panel
Line filter
Handle plate
Ground bracket
MP32
MP33
Spacer
Label
W1
W2
Fan cable
Disk drive cable
A6
A7
A8
A9
Power supply
Disk drive
Monitor assembly
Fan
H2
H3
Ground spring
Locking pin
MP8
MP9
MP15
MP18
MP19
MP20
MP21
Cabinet
Cover
Rear feet
Mounting plate
Insulator
Trim strip
Label
W3
W4
W5
W6
W7
W8
W9
Jumper cable-orange
Jumper cable-white
Power supply cable
Front panel cable
Monitor sweep cable
GPIB cable
RS-232C cable
H4
H22
BNC connector
Cable retaining screw
MP1
MP2
Intensity adjustment
Disk drive bracket
MP22
MP23
MP24
MP25
MP26
Label
Elastomeric keypad
RPG knob
Keyboard panel
Keyboard spacer
6–3
Replacing Assemblies
Exploded View of the 1664A
6–4
Replacing Assemblies
To remove and replace the handle
To remove and replace the handle
• Remove the two screws in the endcaps, then lift off the handle.
To remove and replace the feet and tilt stand
Remove the screws connecting the four rear feet to the instrument.
Separate the rear feet from the instrument to remove them.
Press the locking tab on the bottom feet, then remove them.
Remove the tilt stand from the bottom front feet by lifting the stand up and out of
the foot.
5 Reverse this procedure to install the feet and tilt stand.
1
2
3
4
To remove and replace the cover
1 Disconnect the logic analyzer cables from the rear panel.
2 Using the previous procedures, remove the handle and the four rear feet.
3 Remove the seven screws from the front molding, then slide the molding forward to
remove it.
4 Remove the cover.
To remove the cover, set the instrument upright and facing toward you. Slide the chassis
toward the front, out of the cover, and set it on a static-safe work area.
5 Reverse this procedure to install the cover.
Check that all assemblies are properly installed before installing the cover.
When installing the chassis in the cover, check that the tabs located at the bottom, rear of the
cover align with the holes in the rear panel.
6–5
Replacing Assemblies
To remove and replace the disk drive
To remove and replace the disk drive
1 Using previous procedures, remove the following assemblies:
• Handle
• Rear Feet
• Cover
2
3
4
5
Disconnect the disk drive cable from the rear of the disk drive.
Remove the two screws that attach the disk drive bracket to the power supply.
Slide the disk drive toward the rear of the instrument, then lift it up and out.
Remove the disk drive bracket.
To remove the disk drive bracket, remove the four screws that attach the disk drive bracket to
the disk drive.
6 Reverse this procedure to install the disk drive.
Check that the following assemblies are properly installed before installing the disk drive:
•
•
•
•
•
Monitor
Front Panel
Switch Actuator
Main Circuit Board
Power Supply
6–6
Replacing Assemblies
To remove and replace the power supply
To remove and replace the power supply
1 Using previous procedures, remove the following assemblies:
•
•
•
•
Handle
Rear Feet
Cover
Disk Drive
Hazardous voltages exist on the power supply. To avoid electrical shock, disconnect the
power from the instrument before performing the following procedures. After disconnecting
the power, wait at least three minutes for the capacitors to discharge before servicing the
instrument.
WARNING
2 Lift the PCB locking pins out of the chassis.
3 Slide the power supply out far enough to reach the power supply cables, then
disconnect them from the power supply.
4 Slide the power supply the rest of the way out the side of the instrument.
5 Reverse this procedure to install the power supply.
Check that the following assemblies are properly installed before installing the power supply:
•
•
•
•
Monitor
Front Panel
Switch Actuator
Main Circuit Board
To remove and replace the Main Circuit board
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
2
3
4
5
6
Handle
Rear Panel
Cover
Disk Drive
Power Supply
Disconnect the GPIB and RS-232C cables from the Main Circuit board.
Disconnect the front panel cable from the Main Circuit board.
Disconnect the monitor board cable from the Main Circuit board.
Slide the board out the rear of the instrument.
Reverse this procedure to install the Main Circuit board.
Check that the following assemblies are properly installed before installing the Main Circuit
board:
• Monitor
• Front Panel
• Switch Actuator
6–7
Replacing Assemblies
To remove and replace the switch actuator assembly
To remove and replace the switch actuator assembly
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
•
Handle
Rear Feet
Cover
Disk Drive
Power Supply
Main Circuit board
2 Make sure the power switch is in the off position.
3 Disconnect the switch actuator from the line filter.
a Slide the clamp off of the outer casing far enough to release the switch actuator
assembly.
CAUTION
If the wire in the switch actuator is bent, the complete assembly must be replaced. Refer to
chapter 5, "Replaceable Parts" for the part number.
b Without bending the wire, gently pry the nipple out of the switch plunger.
c Slide the cable out of the switch assembly.
4 Remove the switch actuator assembly from the front of the cabinet.
To remove, depress the retaining ears on both sides of the assembly next to the front panel
and push the assembly out the front.
5 Install the new switch actuator assembly. Make sure that the line filter switch is in
the off position.
a Route the cable through the front panel, then snap the pushbutton into the front panel.
b Snap the nipple into the switch plunger.
c Position the free end of the outer casing into the switch mounting chassis. The edge
of the outer casing should be all the way against the inner edge of the switch mounting
chassis.
d Close the clamp by pushing it into the switch assembly until the clamp is seated.
6 Verify the push-on, push-off action of the assembly.
6–8
Replacing Assemblies
To remove and replace the rear panel assembly
To remove and replace the rear panel assembly
1 Using previous procedures, remove the following assemblies:
• Handle
• Rear Feet
• Cover
2 Remove the switch actuator cable from the line filter according to "To remove and
replace the switch actuator assembly."
3 Disconnect the BNC In/Out and fan cables on the Main Circuit board.
4 Disconnect the RS-232C an GPIB cables from the Main Circuit board.
5 Remove the two standoffs connecting the parallel printer connector socket to the
6
7
8
9
rear panel.
Remove the two screws connecting the keyboard connector socket to the rear panel.
Remove the six rear panel screws.
Lift the rear panel away from the chassis.
Reverse this procedure to install the rear panel.
Check that the following assemblies are properly installed before installing the rear panel:
• Monitor
• Main Circuit Board
When installing the rear panel, check that the connectors on the main circuit board are lined
up with the corresponding holes in the rear panel.
6–9
Replacing Assemblies
To remove and replace the front panel and keyboard
To remove and replace the front panel and keyboard
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
•
Handle
Rear Feet
Cover
Disk Drive
Power Supply
Main Circuit board
2 Remove the four screws connecting the front panel.
3 Slide the front panel assembly out the front of the instrument.
4 Slide the spacers out the front of the instrument to remove them.
Be careful not to lose the copper ground strips on the spacer.
When installing the spacer, insert the pins of the spacer in the appropriate holes in the
chassis. You can hold the spacer in place while installing the front panel by holding it with
your finger through the disk drive mounting slot in the chassis.
5 Remove the RPG knob by pulling the knob off the RPG shaft.
6 Disassemble the front panel assembly by lifting the keyboard circuit board away
from the front panel.
7 Lift the elastomeric keypad out of the front panel.
8 Reverse this procedure to assemble and install the front panel assembly.
When assembling the front panel, check that the holes in the elastomeric keypad and the
keyboard circuit board align with the pins on the front panel.
To remove and replace the intensity adjustment
1 Using previous procedures, remove the following assemblies:
•
•
•
•
Handle
Rear Feet
Cover
Rear Panel
2 Disconnect the intensity adjustment cable from the CRT driver board.
3 Using a nut driver, remove the hex nut attaching the intensity adjustment to the
chassis.
4 Slide the intensity adjustment assembly toward the front and up out of the
instrument.
5 Reverse this procedure to install the intensity adjustment.
When installing the intensity adjustment, check that the keying tab on the adjustment aligns
with the keying hole in the chassis.
6–10
Replacing Assemblies
To remove and replace the monitor
To remove and replace the monitor
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
•
•
Handle
Rear Feet
Cover
Disk Drive
Power Supply
Main Circuit board
Rear Panel
Hazardous voltages exist on the CRT and the CRT driver board. To avoid electrical shock,
disconnect the power from the instrument before performing the following procedures. After
disconnecting the power, wait at least three minutes for the capacitors to discharge before
servicing the instrument.
WARNING
Disconnect the cable from the rear of the CRT.
Disconnect the yoke cable and intensity cable from the CRT driver board.
Disconnect the high voltage lead from the bell of the CRT.
Slide the CRT driver board up out of the chassis.
Using a nut driver, remove the three hex nuts attaching the monitor and ground
bracket to the chassis, then remove the screw.
7 Slide the monitor assembly and ground bracket to the rear and up out of the chassis.
8 Reverse this procedure to install the monitor.
2
3
4
5
6
When installing the CRT driver board, check that the board is properly inserted in the circuit
board tracks.
To remove and replace the handle plate
1 Using previous procedures, remove the following assemblies:
• Handle
• Rear Feet
• Cover
2 Remove the four screens that attach the handle plate to the chassis.
3 Remove the handle plate.
To remove the handle plate, align the plate toward the front of the instrument, then move it
up and out of the instrument.
4 Reverse this procedure to install the handle plate.
6–11
Replacing Assemblies
To remove and replace the fan
To remove and replace the fan
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
•
2
3
4
5
6
Handle
Rear Feet
Cover
Disk Drive
Power Supply
Rear Panel
Disconnect the fan cable from the main circuit board.
Remove the four fan screws.
Lift the fan away from the rear panel.
Lift the fan guard away from the rear panel.
Reverse this procedure to install the fan.
When installing the fan, verify the correct orientation of the fan. If you mount the fan
backwards, the instrument will overheat. Also, check the correct polarity of the fan cable.
To remove and replace the line filter
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
•
2
3
4
5
6
Handle
Rear Feet
Cover
Disk Drive
Power Supply
Rear Panel
Unsolder the ground wire from the lug on the rear panel.
Disconnect the line filter cable from the power supply.
Remove the two screws attaching the line filter to the rear panel.
Slide the line filter assembly out toward the rear.
Reverse this procedure to install the line filter.
6–12
Replacing Assemblies
To remove and replace the optional GPIB and RS-232C cables
To remove and replace the optional GPIB and RS-232C cables
1 Using previous procedures, remove the following assemblies:
•
•
•
•
•
•
Handle
Rear Feet
Cover
Disk Drive
Power Supply
Rear Panel
2 Disconnect interface cables from the main circuit board.
3 Remove the two hex standoffs connecting the GPIB cable, then slide the GPIB cable
forward and out of the rear panel.
4 Remove the two hex standoffs connecting the RS-232C cable, then slide the RS-232C
cable forward and out of the rear panel.
5 Reverse this procedure to install the GPIB and RS-232C cables.
6–13
Replacing Assemblies
To return assemblies
To return assemblies
Before shipping the logic analyzer or assemblies to Agilent Technologies, contact your nearest
Agilent Technologies sales office for additional details.
1 Write the following information on a tag and attach it to the part to be returned.
•
•
•
•
Name and address of owner
Model number
Serial number
Description of service required or failure indications
2 Remove accessories from the logic analyzer.
Only return accessories to Agilent Technologies if they are associated with the failure
symptoms.
3 Package the logic analyzer.
You can use either the original shipping containers, or order materials from an Agilent
Technologies sales office.
CAUTION
For protection against electrostatic discharge, package the logic analyzer in electrostatic
material.
4 Seal the shipping container securely, and mark it FRAGILE.
6–14
7
Replaceable Parts Ordering 7–2
Exploded View 7–3
Replaceable Parts List 7–4
Power Cables and Plug Configurations 7–8
Replaceable Parts
Replaceable Parts
This chapter contains information for identifying and ordering replaceable parts for
your logic analyzer.
Replaceable Parts Ordering
Parts listed
To order a part on the list of replaceable parts, quote the Agilent Technologies part number,
indicate the quantity desired, and address the order to the nearest Agilent Technologies Sales
Office.
Parts not listed
To order a part not on the list of replaceable parts, include the model number and serial
number of the module, a description of the part (including its function), and the number of
parts required. Address the order to your nearest Agilent Technologies Sales Office.
Direct mail order system
To order using the direct mail order system, contact your nearest Agilent Technologies Sales
Office.
Within the USA, Agilent Technologies can supply parts through a direct mail order system.
The advantages to the system are direct ordering and shipment from the Agilent Technologies
Part Center in Mountain View, California. There is no maximum or minimum on any mail
order. (There is a minimum amount for parts ordered through a local Agilent Technologies
Sales Office when the orders require billing and invoicing.) Transportation costs are prepaid
(there is a small handling charge for each order) and no invoices.
In order for Agilent Technologies to provide these advantages, a check or money order must
accompany each order. Mail order forms and specific ordering information are available
through your local Agilent Technologies Sales Office. Addresses and telephone numbers are
located in a separate document at the back of the service guide.
Exchange Assemblies
Some assemblies are part of an exchange program with Agilent Technologies.
The exchange program allows you to exchange a faulty assembly with one that has been
repaired and performance verified by Agilent Technologies.
After you receive the exchange assembly, return the defective assembly to Agilent
Technologies. A United States customer has 30 days to return the defective assembly. If you
do not return the defective assembly within the 30 days, Agilent Technologies will charge you
an additional amount. This amount is the difference in price between a new assembly and
that of the exchange assembly. For orders not originating in the United States, contact your
nearest Agilent Technologies Sales Office for information.
See Also
"To return assemblies," in chapter 6.
7–2
Replaceable Parts
Exploded View
Exploded View
Exploded view of the 1664A logic analyzer.
7–3
Replaceable Parts
Replaceable Parts List
Replaceable Parts List
The replaceable parts list is organized by reference designation and shows exchange
assemblies, electrical assemblies, then other parts.
The exploded view does not show all of the parts in the replaceable parts list.
Information included for each part on the list consists of the following:
•
•
•
•
Reference designator
Agilent Technologies part number
Total quantity included with the instrument (Qty)
Description of the part
Reference designators used in the parts list are as follows:
•
•
•
•
•
•
A Assembly
E Miscellaneous Electrical Part
F Fuse
H Hardware
MP Mechanical Part
W Cable
7–4
Replaceable Parts
Replaceable Parts List
1664A Replaceable Parts
Ref.
Des.
Agilent
Part
Number
Qty
Description
Exchange Board
Exchange main circuit assembly
01664-69501
Replacement Parts
Main circuit assembly
Board assembly-keyboard
Switch actuator
Probe Cable
Probe tip assembly
A1
A2
A3
A4
A5
01664-66501
01660-66502
01660-61901
01660-61605
01650-61608
1
1
1
1
2
A6
A7
A8
A9
A10
0950-2261
0950-2169
2090-0304
3160-0829
1150-1922
1
1
1
1
1
E1
E2
E3
E4
5959-9333
5959-9334
5959-9335
5090-4356
Replacement probe leads (5 per package)
Replacement probe grounds (5 per package)
Replacement pod grounds (5 per package)
Grabber kit assembly (20 grabbers per package)
F1
2110-0055
1 Fuse (4 A, 250V)
H1
H2
H3
H4
H5
1400-0611
01660-09101
01650-46101
01660-67601
0515-1363
1
1
2
2
10
Clamp-cable
Ground spring
Locking pin PCB
BNC connector assembly
MS 3.0 5 TH T10 (disk drive, handle plate)
H6
H7
H8
0515-0680
0380-1858
0515-0430
2
2
11
H9
H10
0515-2349
0515-1035
5
2
MS 3.0 6 PH T10 (rear panel to HIL connector)
Jackscrew with lock (printer port to rear panel)
MS M3.0X0.5X6MM PH T10 (main circuit assembly, rear panel
to chassis , RS-232C/GPIB cover plate)
MS M3.0X0.50X14MM LG (trim strip cover to cabinet)
MSFH M3 8 T10 (line filter)
H11
H12
H13
H14
H15
0515-1103
0515-0664
2950-0072
2950-0001
0535-0056
2
4
1
2
3
MSFH M3 10 T10 (trim strip cover to cabinet)
MSPH M3 12 SMS10 (rear feet to cabinet)
NUTH 1/4-32 .062 (intensity adjustment)
NUTH 3/8-32 .093 (BNC trigger ports)
NUT-HEX (monitor assembly)
H16
H17
H18
H19
H20
0515-0382
0515-1349
3050-0010
2190-0027
2190-0016
3
4
4
1
2
SM ASSY M4X0.7 12MM LG (monitor assembly, handle)
SM M3X0.5 30MM LG (front panel assembly)
WFL.147 .312 .03 (rear feet)
WIL.256 .478 .02 (intensity adjustment)
WIL.377 .507 .02 (BNC trigger ports)
H21
H22
H23
H24
0515-1031
0515-2306
2510-0332
1252-2218
4
2
4
2
MSFH M3 6 T10 (accessory pouch)
Screw Sems M3 X0.5X10mm (Cable Retaining Screw)
SCR-MACH 8-32 (Fan)
Cable Retaining Clip-20-pin connector (Monitor sweep cable)
Power supply
Disk drive
Monitor assembly
Fan-tubeaxial
Three-button mouse
7–5
Replaceable Parts
Replaceable Parts List
1664A Replaceable Parts
Ref.
Des.
Qty
Description
H25
Agilent
Part
Number
1252-2220
1
Cable Retaining Clip-34-pin connector (Disk drive cable)
MP1
MP2
MP3
MP4
MP5
01660-61606
01660-01203
3160-0092
01664-00201
54501-62702
1
1
1
1
1
Intensity adjustment assembly
Bracket-disk drive
Fan guard
Rear panel
Line filter/cable assembly
MP6
MP7
MP8
MP9
MP10
01660-01202
01650-01202
01660-60001
01660-04102
54542-44901
1
1
1
1
1
Handle plate
Ground bracket
Cabinet assembly
Cover assembly
Handle vinyl grip
MP11
MP12
MP13
MP14
MP15
35672-21703
35672-45004
5041-8801
1460-1345
01660-40501
2
2
2
2
4
Strap retainer
Handle end cap
Foot
Tilt Stand
Rear foot
MP16
MP17
MP18
MP19
MP20
5041-8822
01660-45401
01660-01201
01660-84501
01660-40502
2
1
1
1
1
Non-skid foot
Circuit board insulator
Circuit board mounting plate
Accessory pouch
Trim strip
MP21
MP22
MP23
MP24
MP25
01664-94301
01660-94302
01660-41901
01660-47401
01660-60002
1
1
1
1
1
ID label (1664A)
Line switch label
Elastomeric keypad
RPG knob
Assembled keyboard panel and label
MP26
MP27
MP28
01660-45201
01660-94303
01660-44703
01660-44702
01660-94306
0
0
1
1
Keyboard panel-replacement
Keyboard label-replacement
Keyboard spacer
Front panel spacer
Keyboard template, enter (accessory)
MP29
MP30
MP31
MP32
MP33
01660-94305
01664-04101
16555-60001
01664-44701
01660-94304
1
1
1
1
Keyboard template, F1-F8 (accessory)
Rear panel cover plate (RS-232, GPIB)
Ferrite Core Assembly
Rubber Spacer (Ferrite)
Label-Pods and Cable
W1
W2
W3
W4
W5
01650-61616
01660-61603
01660-61607
01660-61608
54503-61606
1
1
1
1
1
Fan cable
Disk drive cable
Jumper cable assembly-orange
Jumper cable assembly-white
Power supply cable
W6
01664-61601 1
7–6
Front Panel Cable Extender
Replaceable Parts
Replaceable Parts List
1664A Replaceable Parts
Ref.
Des.
W7
Agilent
Part
Qty
Number
01650-61601 1
Option #020
E5
H26
H27
H28
MP34
01650-63202
0380-1482
2190-0009
0380-1858
1258-0141
W8
W9
01650-61613 1
01660-61601 1
Power Cords
W10
8120-1521
8120-0696
8120-1692
8120-2296
8120-2957
8120-4600
8120-4754
1
2
2
2
1
1
1
1
1
1
1
1
Description
Monitor sweep cable
RS-232 loopback connector
Hex standoff (GPIB Cable)
WIL.168 .340 .02 (GPIB Cable)
Jackscrew with lock (RS-232 Cable)
Removable jumper
GPIB Cable
RS-232C Cable
Power Cord: United Kingdow (#900)
Power Cord: Australia (#901
Power Cord: Europe (#902)
Power Cord: Switzerland (#906)
Power Cord: Denmark (#912)
Power Cord: Africa (#917)
Power Cord: Japan (#918)
7–7
Replaceable Parts
Power Cables and Plug Configurations
Power Cables and Plug Configurations
This instrument is equipped with a three-wire power cable. The type of power cable plug
shipped with the instrument depends on the country of destination. The W10 reference
designators (table, previous page) show option numbers of available power cables and plug
configurations.
7–8
8
Block-Level Theory 8-3
The 1660 Series Logic Analyzer 8-3
The Logic Acquisition Circuitry 8-6
Self-Tests Description 8-9
Power-up Self-Tests 8-9
System Tests (System PV) 8-10
Analyzer Tests (Analy PV) 8-13
GPIB 8-15
RS-232C 8-16
Centronix 8-17
Theory of Operation
Theory of Operation
This chapter tells the theory of operation for the logic analyzer and describes the
self-tests. The information in this chapter is to help you understand how the logic
analyzer operates and what the self-tests are testing. This information is not
intended for component-level repair.
8–2
Block-Level Theory
The block-level theory is divided into two parts: theory for the logic analyzer and
theory for the main circuit board. A block diagram is shown with each theory.
The 1664A Logic Analyzer
The 1664A logic analyzer
8–3
Theory of Operation
The 1664A Logic Analyzer
1664A Theory
CPU
Located on the main circuit board, the microprocessor is a Motorola 68EC020 running at
25 MHz. The microprocessor controls all of the functions of the logic analyzer including
processing and storing data, displaying data, and configuring the acquisition ICs to obtain and
store data.
System Memory
The system memory is made up of both read-only memory (ROM) and random access memory
(RAM). A single 128Kx8 EPROM is used as a boot ROM (boot-up requires operating system
on disk loaded in the disk drive). Four 1Mx4 DRAMS are configured to provide a 1Mx16
DRAM space.
On power-up, instructions in the boot ROM command the instrument to execute its boot
routine, which loads the operating system from disk. The boot routine (on disk) includes
power-up operation verification of the instrument subsystems and entering the operating
system. The CPU searches for the operating system on disk.
The DRAM stores the instrument configuration, acquired data to be processed, and any
inverse assembler loaded in the instrument by the user.
CRT Controller and Display RAM
A Brooktree BT476KPJ66 RAMDAC color palette and a National Semiconductor LM1882CM
video frame generator control the CRT. One of the RGB outputs of the color palette provides
the eight-shade grey scale display. The video frame generator provides the horizontal and
vertical synchronization timing signals.
The display RAM is made up of two 256Kx4 DRAMS configured as 256Kx8 and stores all of
the pixel information used by the color palette. A serial address counter and an address
multiplexer control the DRAM addressing. At the conclusion of each video frame the vertical
sync signal from the video generator resets the serial address counter and a new frame is
generated.
Disk Drive Controller
The disk drive controller consists of a single floppy drive controller IC. The floppy drive
controller provides all signals to the disk drive including read and write data, read and write
signals, write gate, and step signal. The floppy drive controller also reads status signals from
the disk drive, including a track 00 signal, disk ready, and disk change signal.
Keypad and Knob Interface
The front panel keypad is scanned directly from the microprocessor address bus during the
video blanking cycle of the CRT. When a front panel key is pressed the associated address
bits are fed to the data bus through the pressed key and read by the microprocessor.
The rotary pulse generator (RPG) knob is part of the HIL circuitry. Pulses and direction of
rotation information are directed to an RPG interface IC and then to the HIL loop. The
microprocessor then reads and interprets the RPG signals and performs the desired tasks.
8–4
Theory of Operation
The 1664A Logic Analyzer
External Keyboard Interface
Agilent proprietary ICs make up the external keyboard interface. The ICs establish a link with
the controller IC on the external keyboard. The keyboard signals are routed through the
acquisition circuit board to the CPU board. The microprocessor then reads and interprets the
external keyboard and mouse information and performs the desired tasks.
Centronix Interface
The instrument parallel printer interface is compatible with industry standard Centronix
protocol. The interface consists of a controller, and drivers/receivers. The controller
conditions parallel data from the microprocessor for transmission. At the same time the
controller also receives status information for the microprocessor. Data flow, status, and
handshaking control are also provided by the controller.
Optional GPIB Interface
The instrument interfaces to GPIB as defined by IEEE Standard 488.2. The interface consists
of an GPIB controller and two octal drivers/receivers. The microprocessor routes GPIB data
to the controller. The controller then buffers the 8-bit GPIB data bits and generates the bus
handshaking signals. The data and handshaking signals are then routed to the GPIB bus
through the octal line drivers/receivers. The drivers/receivers provide data and control signal
transfer between the bus and controller.
Optional RS-232C Interface
The instrument RS-232C interface is compatible with standard RS-232C protocol. The
interface consists of a controller, and drivers/receivers. The controller serializes parallel data
from the microprocessor for transmission. At the same time the controller also receives serial
data and converts the data to parallel data characters for the microprocessor.
The controller contains a baud rate generator that can be programmed from the logic analyzer
front panel for one of eight baud rates. Other RS-232C communications parameters can also
be programmed from the logic analyzer front panel.
The drivers/receivers interface the instrument with data communications equipment. Slew
rate control is provided on the ICs eliminating the need for external capacitors.
CRT Monitor Assembly
The CRT Monitor Assembly consists of a monochrome CRT and a monitor driver board. The
monitor driver board provides the biasing and control signals for the CRT. Pixel information
is stored in the display RAM on the CPU board and is routed to the monitor driver board
through the acquisition board and the sweep cable.
Disk Drive
The disk drive assembly is a high density disk drive that formats double-sided, double-density
or high density disks in LIF or DOS format. A disk drive controller on the CPU board controls
the disk drive. Signals are routed directly to the disk drive through the disk drive cable.
Power Supply
A low voltage power supply provides all DC voltages needed to operate the logic analyzer.
The power supply also provides the +5 Vdc voltage to the probe cables to power logic analyzer
accessories and preprocessors.
Unfiltered voltages of +12 V, -12 V, +5 V, -5.2 V, and +3.5 V are supplied to the acquisition
board where they are filtered and distributed to the CPU board, CRT Monitor Assembly, and
probe cables.
8–5
Theory of Operation
The Logic Acquisition Circuitry
The Logic Acquisition Circuitry
The Main Circuit Board Logic Acquisition Circuitry
8–6
Theory of Operation
The Logic Acquisition Circuitry
Main Circuit Board Logic Acquisition Theory
Probing
The probing circuit includes the probe cable and terminations. The probe cable consists of
two 17-channel pods which are connected to the circuit board using a high-density connector.
Sixteen single-ended data channels and one single-ended clock/data channel are passed to the
circuit board per pod.
If the clock/data channel is not used as a state clock in state acquisition mode, it is available as
a data channel. The clock/data channel is also available as a data channel in timing acquisition
mode. Two clock/data channels are available as data channels, and all clock data channels
available can be assigned as clock channels.
The cables use nichrome wire woven in polyarmid yarn for reliability and durability. The pods
also include one ground path per channel in addition to a pod ground. The channel grounds
are configured such that their electrical distance is the same as the electrical distance of the
channel.
The probe tip assemblies and termination modules connected at the end of the probe cables
have a divide-by-10 RC network that reduces the amplitude of the data signals as seen by the
circuit board. This adds flexibility to the types of signals the circuit board can read in addition
to improving signal integrity.
The terminations on the circuit board are resistive terminations that reduce transmission line
effects on the cable. The terminations also improve signal integrity to the comparators by
matching the impedance of the probe cable channels with the impedance of the signal paths of
the circuit board. All 17 channels of each pod are terminated in the same way. The signals
are still reduced by a factor of 10.
Comparators
Two proprietary 9-channel comparators per pod interpret the incoming data and clock signals
as either high or low depending on where the user-programmable threshold is set. The
threshold voltage of each pod is individually programmed, and the voltage selected applies to
the clock channel as well as the data channels of each pod.
Each of the comparator ICs has a serial test input port used for testing purposes. A test bit
pattern is sent from the Test and Clock Synchronization Circuit to the comparator. The
comparators then propagate the test signal on each of the nine channels of the comparator.
Consequently, all data and clock channel pipelines on the circuit board can be tested by the
operating system software from the comparator.
Acquisition
The acquisition circuit is made up of a single Agilent Technologies proprietary ASIC. Each
ASIC is a 34-channel state/timing analyzer, and one such ASIC is included for every two logic
analyzer pods. All of the sequencing, pattern/range recognition, and event counting functions
are performed on board the IC.
In addition to the storage qualification and counting functions, the acquisition ASICs also
perform master clocking functions. All six state acquisition clocks are fed to each IC, and the
ICs generate their own sample clocks. Every time you select RUN, the ICs individually
perform a clock optimization before data is stored.
8–7
Theory of Operation
The Logic Acquisition Circuitry
Clock optimization involves using programmable delays on board the IC to position the master
clock transition where valid data is captured. This procedure greatly reduces the effects of
channel-to-channel skew and other propagation delays.
In the timing acquisition mode, an oscillator-driven clock circuit provides a four-phase,
100-MHz clock signal to each of the acquisition ICs. For high speed timing acquisition
(100 MHz and faster), the sample period is determined by the four-phase, 100-MHz clock
signal.
For slower sample rates, one of the acquisition ICs divides the 100-MHz clock signal to the
appropriate sample rate. The sample clock is then fed to all acquisition ICs.
Threshold
A precision octal DAC and precision op amp drivers make up the threshold circuit. Each of
the eight channels of the DAC is individually programmable which allows you to set the
thresholds of the individual pods. The 16 data channels and the clock channel of each pod are
all set to the same threshold voltage.
Test and Clock Synchronization Circuit
ECLinPS (TM) ICs are used in the Test and Clock Synchronization Circuit for reliability and
low channel-to-channel skew. Test patterns are generated and sent to the comparators during
software operation verification. The test patterns are propagated across all data and clock
channels and read by the acquisition ASIC to ensure both the data and clock pipelines are
operating correctly.
The Test and Clock Synchronization Circuit also generates a four-phase, 100-MHz
sample/synchronization signal for the acquisition ICs operating in the timing acquisition
mode. The synchronizing signal keeps the internal clocking of the individual acquisition
ASICs locked in step with the other ASICs at fast sample rates. At slower sample rates, one of
the acquisition ICs divides the 100-MHz clock signal to the appropriate sample rate. The slow
speed sample clock is then used by all acquisition ICs.
8–8
Self-Tests Description
The self-tests identify the correct operation of major functional areas in the logic
analyzer. The self-tests are not intended for component-level diagnostics.
Three types of tests are performed on the 1664A logic analyzer: the power-up
self-tests, the functional performance verification self-tests, and the parametric
performance verification tests.
The power-up self-tests are performed when power is applied to the instrument.
The functional performance verification self-tests are run using a separate operating
system, the performance verification (PV) operating system. The PV operating
system resides on a separate disk that must be inserted in the disk drive when
running the functional performance verification self-tests. The system and analyzer
tests are functional performance verification tests.
Parametric performance verification requires the use of external test equipment that
generates and monitors test data for the logic analyzer to read. The performance
verification procedures in chapter 3 of this service guide make up the parametric
performance verification for the logic analyzer. Refer to chapter 3, "Testing
Performance," for further information about parametric performance verification.
Power-up Self-Tests
The power-up self-tests are divided into two parts. The first part is the system memory tests
and the second part is the microprocessor interrupt test. The system memory tests are
performed before the logic analyzer actually displays the power-up self-test screen. Both the
system ROM and RAM are tested during power-up. The interrupt test is performed after the
power-up self-test screen is displayed.
The following describes the power-up self-tests:
ROM Test
The ROM test performs several checksum tests on various read only memory elements,
including the system ROM as well as the various software modules present in flash ROM.
Passing the ROM test implies that the microprocessor can access each ROM memory address
and that each ROM segment provides checksums that match previously calculated values.
8–9
Theory of Operation
System Tests (System PV)
RAM Test
The RAM test checks the video RAM (VRAM), system dynamic RAM (DRAM), and static RAM
memory within the real time clock IC. The microprocessor first performs a write/read in each
memory location of the VRAM. At each VRAM memory location a test pattern is written, read,
and compared. An inverse test pattern is then written, read, and compared. After verifying
correct operation of the VRAM, the System RAM and real time clock RAM are tested in a
similar fashion.
Passing the RAM test implies that the microprocessor can access each VRAM memory location
and that each VRAM memory location can store a logical "1" or a logical "0." If the VRAM is
functioning properly, the logic analyzer can construct a correct, undistorted display. Passing
the RAM test also implies that the memory locations of system RAM can be accessed by the
microprocessor and the data in RAM is intact, and that the memory locations inside the real
time clock IC can store a logical "1" or a logical "0."
Interrupt Test
The Interrupt Test checks the microprocessor interrupt circuitry. With all interrupts disabled
from their source, the microprocessor waits for a short period of time to see if any of the
interrupt lines are asserted. An asserted interrupt line during the wait period signifies
incorrect functioning of the device generating the interrupt or the interrupt circuitry itself.
Those interrupts that can be asserted under software control are exercised to verify
functionality.
Passing the Interrupt Test implies that the interrupt circuitry is functioning properly. Passing
the Interrupt Test also implies that the interrupt generating devices are also functioning
properly and not generating false interrupts. This means that the microprocessor can execute
the operating system code and properly service interrupts generated by pressing a front panel
key or receiving an GPIB or RS-232C command.
System Tests (System PV)
The system tests are functional performance verification tests. The following describes the
system tests:
ROM Test
The ROM test performs several checksum tests on various read only memory elements,
including the system ROM.
Passing the ROM test implies that the microprocessor can access each ROM memory address
and that each ROM segment provides checksums that match previously calculated values.
RAM Test
The RAM test performs a write/read operation in each memory location in system dynamic
RAM (DRAM). The video RAM in the display subsystem and the acquisition RAM in the data
acquisition subsystem are not tested as part of the RAM test and are tested elsewhere. At
each DRAM memory location, the code that resides at that location is stored in a
microprocessor register. A test pattern is then stored at the memory location, read, and
compared. An inverse test pattern is then stored, read, and compared. The original code is
then restored to the memory location. This continues until all DRAM memory locations have
been tested. The static RAM in the real time clock chip is also tested in a similar fashion.
Passing the RAM test implies that all RAM memory locations can be accessed by the
microprocessor and that each memory location can store a logical "1" or a logical "0."
8–10
Theory of Operation
System Tests (System PV)
GPIB Test
The GPIB test performs a write/read operation to each of the registers of the GPIB IC. A test
pattern is written to each register in the GPIB IC. The pattern is then read and compared
with a known value. The GPIB test will return a valid "Pass" or "Fail" status even if option 020
is not installed.
Passing the GPIB test implies that the read/write registers in the GPIB IC can store a logical
"1" or a logical "0," and that the GPIB IC is functioning properly. Incoming and outgoing GPIB
information will not be corrupted by the GPIB IC.
RS-232C Test
This test checks the basic interface functions of the RS-232C port. Both internal and external
portions of the port circuitry are tested. In order for the RS-232C test to pass, option 020
must be installed and the RS-232C loopback connector must be installed on the RS-232C
connector.
HIL Test
The HIL test exercises both the HIL circuitry internal to the logic analyzer and the HIL
interface between the logic analyzer and external keyboard, if an external keyboard is
connected. First, a read/write operation is performed to each of the registers of the HIL IC. A
test pattern is written to each memory location, read, and compared with a known value.
Second, if an external keyboard is connected to the HIL port, the keyboard controller that
resides in the keyboard is polled by the microprocessor. A test pattern is sent to the keyboard
controller and returned to the microprocessor by the keyboard controller. The test pattern is
then compared with a known value.
Passing the HIL test implies that the read/write registers in the HIL IC can store a logical "1" or
a logical "0," and that the HIL IC is functioning properly. Also, passing the HIL test implies
that the HIL pathway to the external keyboard is functioning and that the keyboard controller
can communicate with the microprocessor in the logic analyzer. Incoming HIL information
from the external keyboard will not be corrupted by the pathway between the keyboard
controller and microprocessor.
Disk Test
The disk test exercises the disk controller circuitry by performing a read/write on a disk.
Either an LIF formatted disk with 20 sectors available space or a DOS formatted disk with 5K
available space is required and should be inserted in the disk drive. When the disk test is
executed, the disk is checked sector by sector to find any bad sectors. If no bad sectors are
found, a test file is created on the disk and test data is written to the file. Then, the file is
read and the test data is compared with known values. At the conclusion of the test, the test
file is erased.
Passing the disk test implies that the disk controller circuitry in the logic analyzer and the disk
read/write circuitry in the disk drive are functioning properly. The disk drive can read and
write to a LIF or DOS formatted disk, and the data will not be corrupted by the disk drive
circuitry.
8–11
Theory of Operation
System Tests (System PV)
Perform Test All
Selecting Perform Test All will initiate all of the previous functional verification tests in the
order they are listed. The failure of any or all of the tests will be reported in the test menu
field of each of the tests. The Perform All Test will not initiate the Front Panel Test or the
Display Test.
Front Panel Test
A mock-up of the logic analyzer front panel is displayed on the CRT when the Front Panel
Test is initiated. The operator then pushes each front panel button and turns the RPG (rotary
pulse generator) knob to toggle the corresponding fields from light to dark on the front panel
mock-up. Successively pushing any front panel key will cause the corresponding field to
toggle back and forth between light and dark. An exception is the Done key. Pressing the
Done key a second time will cause an exit of this test.
The Front Panel Test passes when all of the key fields in the front panel mock-up on the CRT
can be toggled by pressing the corresponding front panel key, and the two RPG fields can be
toggled by turning the knob. The Front Panel Test is not called when Perform Test All is
selected.
Display Test
When initiated, the display test will cause three test screens to be displayed sequentially. The
first test screens is a test pattern used to align the CRT. The second two screens verify
correct operation of the color palette by displaying first a full bright screen and then a half
bright screen.
The pass or fail status of the display test is determined by the operator. The Display Test
passes when all three test screens are displayed according to chapter 4, "Calibrating and
Adjusting." The display test is not used when Perform Test All is selected.
8–12
Theory of Operation
Analyzer Tests (Analy PV)
Analyzer Tests (Analy PV)
The analyzer tests are functional performance verification tests. There are three types of
analyzer tests: the Board Test, the Chip Test, and the Data Input Inspection. The following
describes the analyzer self-tests:
Board Test
The Board Test functionally verifies the two oscillators and the 9-channel comparators on the
circuit board. First, the oscillators are checked using the event counter on one of the
acquisition ICs. The event counter will count the number of oscillator periods within a
pre-determined time window. The count of oscillator periods is then compared with a known
value.
The comparators are then checked by varying the threshold voltage and reading the state of
the activity indicators. The outputs of the octal DAC are set to the upper voltage limit and the
activity indicators for all of the pod channels are read to see if they are all in a low state.
The octal DAC outputs are then set to the lower voltage limit, and the activity indicators are
read to see if they are in a high state. The DAC outputs are then set to 0.0 V, allowing the
comparators to recognize the test signal being routed to the test input pin of all of the
comparators. Consequently, the activity indicators are read to see if they show activity on all
channels of all of the pods.
Chip Tests
During the Chip Tests, six tests are performed on the acquisition ICs. The tests are the
Communications, Memory, Encoder, Resource, Sequencer, and Clock Generation Tests.
Communications Test The communications test verifies that communications pipeline
between the various subsystems of the IC are operating. Checkerboard patterns of "1s"
and "0s" are routed to the address and data buses and to the read/write registers of each
chip. After verifying the communications pipelines, the acquisition clock synchronization
signals that are routed from IC to IC are checked. Finally, the IC master clock
optimization path is checked and verified.
Passing the communications test implies that the communications pipelines running from
subsystem to subsystem on the acquisition IC are functioning and that the clock optimization
circuit on the IC is functioning. Also, passing this test implies that the acquisition clock
synchronization signals are functioning and appear at the synchronization signal output pins
of the acquisition IC.
Memory Test Acquisition RAM is checked by filling the IC RAM with a checkerboard
pattern of "1s" and "0s," then reading each memory location and comparing the test
pattern with known values. Then, the IC RAM is filled with an inverse checkerboard
pattern, read, and compared with known values.
Passing the memory test implies that the acquisition IC RAM is functioning and that each
memory location bit can hold either a logical "1" or logical "0."
Encoder Test The encoder in the FISO front end is tested and verified using a walking
"1" and walking "0" pattern. The walking "1" and "0" is used to stimulate all of the encoder
output pins which connect directly to the FISO memory cells. Additionally, the post-store
counter in each of the acquisition ICs is tested.
Passing the encoder test implies that the FISO encoder is functioning and can properly route
the acquired data to the acquisition memory FISO RAM. Also, passing this test implies that
the post-store counter on the acquisition ICs is functioning.
8–13
Theory of Operation
Analyzer Tests (Analy PV)
Resource Test The pattern, range, edge, and glitch recognizers are tested and verified.
First, the test register is verified for correct operation. Next, the pattern comparators are
tested to ensure that each bit in the recognizer memory location as well as the logic
driver/receiver are operating. The edge and glitch pattern detectors are then verified in a
similar manner. The range detectors are verified with their combinational logic to ensure
that the in- and out-of-range conditions are recognized.
Passing the resource test implies that all of the pattern, range, edge, and glitch resources are
operating and that an occurrence of the pattern, edge, or glitch of interest is recognized. Also,
passing this test implies that the range recognizers will detect and report in- and out-of-range
acquisition data to the sequencer or storage qualifier. The drivers and receivers at the
recognizer input and output pins of the acquisition IC are also checked to be sure they are
functioning.
Sequencer Test The sequencer, the state machine that controls acquisition storage, is
tested by first verifying that all of the sequencer registers are operating. After the
registers are checked, the combinational logic of the storage qualification is verified.
Then, both the occurrence counter and the sequencer level counter are checked.
Passing the sequencer test implies that all 12 available sequence levels are functioning and
that all possible sequence level jumps can occur. Also, passing this test implies that
user-defined ANDing and ORing of storage qualified data patterns will occur, and that the
occurrence counter that appears at each sequence level is functioning.
Clock Generator Test The master clock generator on the acquisition ICs is tested by
first checking the operation of the clock optimization circuit. The state acquisition clock
paths are then checked to ensure that each state clock and clock qualifier are operating
by themselves and in all possible clock and qualifier combinations. The timing acquisition
optimization circuit is then operationally verified. Finally, the timing acquisition
frequency divider (for slower timing sample rates) is checked.
Passing the clock generator test implies that each acquisition IC can generate its own master
clock whether the clock is generated using a combination of external clocking signals (state
mode) or internal sample clock signals (timing mode).
Data Input Inspection
The data input inspection allows a user to verify that all of the data and clock/data pipelines
are operational. When the data input inspection test is selected, a test signal is fed to the test
input pins of all 9-channel comparators. The test menu displays the activity indicators for all
data and clock/data channels, which should show transitioning data signals on all channels.
The data input inspection is not an active part of the performance verification. However, the
test is useful for identifying failed channels in order to temporarily work around the problem
until the logic analyzer module can be sent to an Agilent Technologies service center for
repair.
8–14
GPIB (Optional)
The General Purpose Interface bus (GPIB) is Agilent Technologies’ implementation
of IEEE Standard 488-1978, "Standard Digital Interface for Programming
Instrumentation." GPIB is a carefully defined interface that simplifies the integration
of various instruments and computers into systems. The interface makes it possible
to transfer messages between two or more GPIB compatible devices. GPIB is a
parallel bus of 16 active signal lines divided into three functional groups according to
function.
Eight signal lines, called data lines, are in the first functional group. The data lines
are used to transmit data in coded messages. These messages are used to program
the instrument function, transfer measurement data, and coordinate instrument
operation. Input and output of all messages, in bit parallel-byte serial form, are also
transferred on the data lines. A 7-bit ASCII code normally represents each piece of
data.
Data is transferred by means of an interlocking "Handshake" technique which permits
data transfer (asynchronously) at the rate of the slowest active device used in that
transfer. The data byte control lines coordinate the handshaking and form the
second functional group.
The remaining five general interface management lines (third functional group) are
used to manage the devices connected to the GPIB. This includes activating all
connected devices at once, clearing the interface, and other operations.
The following figure shows the connections to the GPIB connector located on the
rear panel.
GPIB Interface Connector
8–15
RS-232C(Optional)
The logic analyzer interfaces with RS-232C communication lines through a standard
25 pin D connector. The logic analyzer is compatible with RS-232C protocol. When a
hardwire handshake method is used, the Data Terminal Ready (DTR) line, pin 20 on
the connector, is used to signal if space is available for more data in the logical I/O
buffer. Pin outs of the RS-232C connectors are listed in the following table.
RS-232C Signal Definitions
Pin
Number
Function
RS-232C
Standard
Signal Direction and Level
1
Protective Ground
AA
Not applicable
2
Transmitted Data (TD)
BA
Data from Mainframe
High = Space = "0" = +12 V
Low = Mark = "1" = –12 V
3
Received Data (RD)
BB
Data to Mainframe
High = Space = "0" = +3 V to +25 V
Low = Mark = "1" = –3 V to –25 V
4
Request to Send (RTS)
CA
Signal from Mainframe
High = ON = +12 V
Low = OFF = –12 V
5
Clear to Send (CTS)
CB
Signal to Mainframe
High = ON = +3 V to +12 V
Low = OFF = –3 V to –25 V
6
Data Set Ready (DSR)
CC
Signal to Mainframe
High = ON = +3 V to +25 V
Low = OFF = –3 V to –25 V
7
Signal Ground
AB
Not applicable
8
Data Carrier Detect (DCD)
CF
Signal to Mainframe
High = ON = +3 V to +25 V
Low = OFF = –3 V to –25 V
20
Data Terminal Ready (DTR)
CD
Signal from Mainframe
High = ON = +12 V
Low = OFF = –12 V
23
Data Signal Rate Selector
CH/CI
Signal from Mainframe
Always High = ON = +12 V
8–16
Centronix
The logic analyzer interfaces with Centronix (parallel printer) communication lines
through a standard 25 pin D connector. The logic analyzer is compatible with
Centronix protocol. BUSY is used to indicate when data can be transfered from the
logic analyzer to the printer. DATASTROBE is used to synchronize data
transmissions. Pin outs of the Centronix connector are listed in the following table.
Centronix Signal Definitions
Pin
Number
Function
Centronix
Standard
1
Synchronous signal that is used for data transfer
STROBE
2
Logic analyzer data (LSB)
DATA0
3
Logic analyzer data
DATA1
4
Logic analyzer data
DATA2
5
Logic analyzer data
DATA3
6
Logic analyzer data
DATA4
7
Logic analyzer data
DATA5
8
Logic analyzer data
DATA6
9
Logic analyzer data (MSB)
DATA7
10
Signal used to indicate that data has been received
ACKNLG
11
Signal used to indicate that the printer is busy
BUSY
12
Signal used to indicate that the printer is out of paper
PERROR
13
Signal that indicates that the printer is on-line
SELECT
14
Signal used to select the autofeed function
AUTOFD
15
Signal that indicates command or data error
FAULT
16
Signal used to initialize the printer
INIT
17
Signal used to select the direction of the bi-directional bus
SELECTIN
18 - 25
Ground
GND
8–17
8–18
DECLARATION OF CONFORMITY
according to ISO/IEC Guide 22 and EN 45014
Manufacturer’s Name:
Agilent Technologies
Manufacturer’s Address:
1900 Garden of the Gods Road
Colorado Springs , CO 80901
U.S.A.
Declares, That the product
Product Name:
Logic Analyzer
Model Number(s):
1664A
Product Options:
All
Conforms to the following Product Specifications:
Safety:
IEC 348 / HD 401
UL 1244
CSA - C22.2 No. 231 Series M-89
EMC:
CISPR 11:1990 /EN 55011 (1991): Group 1 Class A
IEC 801-2:1991 /EN 50082-1 (1992): 4 kV CD, 8 kV AD
IEC 801-3:1984 /EN 50082-1 (1992): 3 V/m
IEC 801-4:1988 /EN 50082-1 (1992): 1 kV
Supplementary Information:
The product herewith complies with the requirements of the Low Voltage
Directive 73/23/EEC and the EMC Directive 89/336/EEC.
Colorado Springs, Sept 16, 1994
John Strathman, Quality Manager
European Contact: Your local Agilent Technologies Sales and Service Office or Agilent Technologies GmbH,
Department ZQ / Standards Europe, Herrenberger Strasse 130, 71034 Böblingen Germany (FAX: +49-7031-143143)
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• Service instructions are for
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Hazardous voltage symbol.
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About this edition
This is the first edition of the
Agilent Technologies 1664A
Logic Analyzer Service Guide.
The following list of pages gives
the date of the current edition and
of any changed pages to that
edition.
Publication number 01664-97005
Printed in USA.
Edition dates are as follows:
Second edition, January 2000
First edition, August 1994
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