Manual 20999240

Manual 20999240
Tightly coupled source and measure for active component testing
2400-LV, 2400-C,
2401, 2420, 2420-C,
2440, 2440-C
SourceMeter SMU Instruments
for Optoelectronic I-V Testing
®
The SourceMeter family was developed specifically for
test applications that demand tightly coupled ­precision
voltage and current sourcing and concurrent measurement, including source read back. This family of instruments can be easily programmed to drive laser diodes
throughout the characterization process. Any of them
can also be programmed to act as a synchronization
­controller to ensure simultaneous measurements during
the test sequence. Selecting a fixed current range eliminates the potential for range offsets that appear as kinks
during the LIV sweep testing. The Models 2400-LV and
2401 offer a drive c­ urrent of up to 1A, ideal for testing
VCSEL devices.
• Designed for production
testing of VCSELs, transmitter,
high power pump lasers, and
other high current electronic
components
• Key building block for
programmable LIV test system
for laser diode modules
• Very low noise current source
(50µA) for laser diode drive
• Up to 5A laser diode drive
current
• Trigger Link, Source Memory,
and buffer memory support
automatic test sequencing
• Reduced GPIB bus traffic
improves test throughput
• Expandable and flexible for
future requirements
• Built-in comparator for fast
pass/fail testing
• Digital I/O handler interface
• 1000 readings/second at
4½ digits
SEMICONDUCTOR
• Optional contact check function
The Model 2420 offers a tighter accuracy specification
that allows for precise control of transmitter laser devices. In addition to higher accuracy, the Model 2420 offers a drive current of up to 3A for devices that
need drive currents greater than 1A, such as pump lasers used in EDFA a­ mplifiers.
The Model 2440 5A SourceMeter SMU Instrument further broadens the capabilities offered by the
popular SourceMeter line. The dynamic range and functionality of the Model 2440 makes it ideal for
applications such as testing high power pump lasers for use in optical amplifiers, laser bar tests, and
testing other higher power components. Manufacturers of Raman pump laser modules and optical
amplifiers will find it invaluable for a wide range of design and production test applications.
A Keithley SourceMeter SMU instrument provides a complete, economical, high throughput solution
for component production testing, all in one compact, half-rack box. It combines source, measure,
and control capabilities in a form factor that’s unique to the industry. The SourceMeter is also suitable for making a wide range of low power DC measurements, including resistance at a specified current or voltage, breakdown voltage, leakage current, and insulation resistance.
Single Box Solution
By linking source and measurement circuitry in a single unit, a SourceMeter SMU instrument offers
a variety of advantages over systems configured with separate source and measurement instruments.
For example, it minimizes the time required for test station development, setup, and maintenance,
while lowering the overall cost of system ownership. It simplifies the test ­process itself by eliminating
many of the complex synchronization and connection issues associated with using multiple instruments. Its compact, half-rack size conserves “real estate” in the test rack or bench.
ACCESSORIES AVAILABLE
Laser Diode Mounts
8542
Dual In-Line Telecom Laser Diode Mount Bundle
8544
Butterfly Telecom Laser Diode Mount Bundle
8544-TEC
Butterfly Telecom Laser Diode Mount Bundle
with TEC, thermistor, and AD592CN temperature
sensor
Communication Interface
KPCI-488LPA IEEE-488 Interface/Controller for the PCI Bus
KUSB-488B
IEEE-488 USB-to-GPIB Adapter for USB Port
SWITCHING
7001
7002
7053
HARDWARE
Two-Slot Switch System
Ten-Slot Switch System
High-Current Switch Card
TEST LEADS AND PROBES
5806
Kelvin Clip Lead Set
CABLES/ADAPTERS
2499-DIGIO Digital I/O Expansion Assembly
7007-1
Shielded GPIB Cable, 1m (3.3 ft)
7007-2
Shielded GPIB Cable, 2m (6.6 ft)
7009-5
RS-232 Cable
8501-1
Trigger Link Cable, 1m (3.3 ft)
8501-2
Trigger Link Cable, 2m (6.6 ft)
8502
Trigger Link Adapter Box
RACK MOUNT KITS
4288-1
Single Fixed Rack Mount Kit
4288-2
Dual Fixed Rack Mount Kit
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www.keithley.com
A Greater Measure of Confidence
Measurements up to 20V and 1A, 20W
Power Output
• Source Memory List test sequencer with conditional branching
2400-CGeneral-Purpose
SourceMeter
• Handler/prober interface
• Trigger Link compatibility with switching hardware and other instruments from Keithley
Contact Check, Measurements up to
200V and 1A, 20W Power Output
• High speed comparator, pass/fail limits, mathematical scaling
2401Low Voltage
SourceMeter
• Deep memory buffer
The SourceMeter SMU instruments also offer standard RS-232 and GPIB interfaces for integration
with a PC. Adding one of Keithley’s versatile switch systems enables fast, synchronized multipoint testing.
Measurements up to 20V and 1A, 20W
Power Output
2420High-Current
SourceMeter
Testing Optoelectronic Components
Use a SourceMeter SMU instrument to measure a component’s electrical performance characteristics
and to drive laser diodes and other components.
Measurements up to 60V and 3A, 60W
Power Output
2420-CHigh-Current
SourceMeter
Contact Check, Measurements up to 60V
and 3A, 60W Power Output
5A SourceMeter
Measurements up to 40V and 5A, 50W
Power Output
5A SourceMeter
Contact Check, Measurements up to 40V
and 5A, 50W Power Output
Accessories Supplied
Test Leads, User’s Manual, Service
Manual, and LabVIEW® Drivers
Models 2400-LV/2401
SourceMeter
I
Instruments
Types of Optoelectronic Components
• Laser diodes
• Laser diode modules
• Photodetectots
• Light-emitting diodes (LEDs)
• Photovoltaic cells
Model
Description
Power Output
Voltage Range
Current Range
Ohms Range
2400-LV/2400-C/2401
General Purpose
20 W
±1 µV to ±20 V
±50 pA to ±1.05 A
<0.2 W to >200 W
Optoelectronic components.
VCSELs.
Applications
Model 2420
3A SourceMeter
Instrument
+1A
+20V
V
–100mA
–1A
–60V
+3A
–20V
2420/2420-C
3A
60 W
±1 µV to ±63 V
±500 pA to ±3.15 A
<0.2 W to >200 MW
Transmitter modules.
EDFA pumps.
2440/2440-C
5A
50 W
±1 µV to ±42 V
±500 pA to ±5.25 A
<2.0 W to >200 MW
5A pump laser diodes.
Raman amplifiers.
I
Model 2440
5A SourceMeter
Instrument
I
+100mA
–20V
Typical Tests
• LIV test (laser diodes and LEDs)
• Kink test (laser diode)
• I-V characterization
+5A
+3A
+1A
+1A
+100mA
+100mA
+20V
+60V
–40V
V
–100mA
–10V
+10V
+40V
V
–100mA
–1A
–1A
= duty cycle limited
–3A
–3A
–5A
The Models 2400-LV and 2401 are ideal for testing a wide
variety of devices, including diodes, resistors, resistor
networks, active circuit protection devices, and portable
battery-powered devices and components.
Choose the Model 2420 for testing higher power
resistors, thermistors, I DDQ , solar cells, batteries, and
high-current or medium power diodes, including
switching and Schottky diodes.
The Model 2440’s wide dynamic range is well-suited
for applications such as testing high-power pump lasers
for use in optical amplifiers and laser bar tests, as well
as testing other higher power components.
1.888.KEITHLEY (U.S. only)
www.keithley.com
A Greater Measure of Confidence
Tightly coupled source and measure for active component testing
2400-LVLow Voltage
SourceMeter
2440-C
®
High Throughput to Meet Demanding Production Test Schedules
A SourceMeter SMU instrument’s highly integrated architecture offers significant throughput advantages. Many features of this family enable them to “take control” of the test process, eliminating
additional system bus traffic and maximizing total throughput. Built-in features that make this possible include:
Ordering Information
2440
SourceMeter SMU Instruments
for Optoelectronic I-V Testing
SEMICONDUCTOR
2400-LV, 2400-C,
2401, 2420, 2420-C,
2440, 2440-C
2400-LV, 2400-C,
2401, 2420, 2420-C,
2440, 2440-C
SourceMeter SMU Instruments
for Optoelectronic I-V Testing
®
Faster, Easier, and More Efficient Testing
and Automation
2400, 2420, 2440 specifications
Coupled Source and Measure Capabilities
The tightly coupled nature of a SourceMeter SMU instrument provides
many advantages over separate instruments. The ability to fit a source and
a meter in a single half-rack enclosure saves valuable rack space and simplifies the remote programming interface. Also, the tight control and a single
GPIB address inherent in a single instrument result in faster test times for
ATE applications due to reduced GPIB traffic.
Standard and Custom Sweeps
SourceMeter SMU instruments provide sweep solutions that greatly accelerate testing with automation hooks for additional throughput improvement.
SourceMeter SMU Instrument Specifications
The following tables summarize the capabilities of the Models 2400-LV, 2420, and 2440.
2400-LV SourceMeter (I-V Measurements)
Current Programming Accuracy
Accuracy (1 Year)
Programming
23°C ± 5°C
RangeResolution
± (% rdg. + amps)
1.00000 µA
50 pA
0.035% + 600 pA
10.0000 µA
500 pA
0.033% + 2nA
100.000 µA
5 nA
0.031% + 20nA
1.00000mA
50 nA
0.034% + 200nA
10.0000 mA
500 nA
0.045% + 2µA
100.000 mA
5 µA
0.066% + 20µA
1.00000 A
50 µA
0.27 % +900µA
2420 SourceMeter (I-V Measurements)
Current Programming Accuracy
Accuracy (1 Year)
Programming
23°C ± 5°C
RangeResolution
± (% rdg. + amps)
10.0000 µA
500 pA
0.033% + 2nA
100.000 µA
5 nA
0.031% + 20nA
1.00000mA
50 nA
0.034% + 200nA
10.0000 mA
500 nA
0.045% + 2µA
100.000 mA
5 µA
0.066% + 20µA
1.00000 A
50 µA
0.067% +900µA
3.00000 A
50 µA
0.059% + 2.7mA
SEMICONDUCTOR
Optional Contact Check
The Contact Check option available on all Series 2400 SourceMeter SMU
instruments allows quick verification of a good connection to the DUT
before functional testing proceeds. This feature helps prevent the loss of
precious test time due to damaged, corroded, or otherwise faulty contacts
in a test fixture. The innovative contact check design completes the verification and notification process in less than 350µs; comparable capabilities
in other test equipment can require up to 5ms to perform the same function. Contact check failure is indicated on the instrument’s front panel and
over the GPIB bus. The digital I/O interface can also be used to communicate contact failure to the component handler in automated applications.
2440 SourceMeter (I-V Measurements)
Current Programming Accuracy
Accuracy (1 Year) 3
Programming
23°C ± 5°C
RangeResolution
± (% rdg. + amps)
10.0000 µA
500 pA
0.033% + 2nA
100.000 µA
5 nA
0.031% + 20nA
1.00000 mA
50 nA
0.034% + 200nA
10.0000 mA
500 nA
0.045% + 2µA
100.000 mA
5 µA
0.066% + 20µA
1.00000 A
50 µA
0.067% +900µA
5.00000 A
50 µA
0.10 % + 5.4mA
Voltage Measurement Accuracy
Accuracy (1 Year)
Default
Input
23°C ±5°C
RangeResolutionResistance
± (% rdg. + volts)
200.000 mV
1 µV
> 10 GW
0.01 % +300 µV
2.00000 V
10 µV
> 10 GW
0.012% +300 µV
20.0000 V
100 µV
> 10 GW
0.015% + 1.5 mV
Voltage Measurement Accuracy
Accuracy (1 Year)
Default
Input
23°C ±5°C
RangeResolutionResistance
± (% rdg. + volts)
200.000 mV
1 µV
> 10 GW
0.012% +300 µV
2.00000 V
10 µV
> 10 GW
0.012% +300 µV
20.0000 V
100 µV
> 10 GW
0.015% + 1 mV
60.0000 V
1 mV
> 10 GW
0.015% + 3 mV
Voltage Measurement Accuracy
Accuracy (1 Year)
Default
Input
23°C ±5°C
RangeResolutionResistance
± (% rdg. + volts)
200.000 mV
1 µV
> 10 GW
0.012% +300 µV
2.00000 V
10 µV
> 10 GW
0.012% +300 µV
10.0000 V
100 µV
> 10 GW
0.015% +750 µV
40.0000 V
1 mV
> 10 GW
0.015% + 3 mV
1.888.KEITHLEY (U.S. only)
www.keithley.com
A Greater Measure of Confidence
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