50A, High Power System SourceMeter SMU Instrument 2651a

50A, High Power System SourceMeter SMU Instrument 2651a
• Source or sink:
–– 2,000W of pulsed power
(±40V, ±50A)
–– 200W of DC power
(±[email protected]±20A, ±[email protected]±10A,
±[email protected]±5A)
• Easily connect two units (in
series or parallel) to create
solutions up to ±100A or ±80V
• 1pA resolution enables precise
measurement of very low
leakage currents
• 1μs per point (1MHz),
18-bit sampling, accurately
characterizes transient behavior
• 1% to 100% pulse duty cycle for
pulse width modulated (PWM)
drive schemes and devicespecific drive stimulus
• Combines a precision power
supply, current source, DMM,
arbitrary waveform generator,
V or I pulse generator with
measurement, electronic load,
and trigger controller—all in one
instrument
• Includes TSP® Express I-V
characterization software,
LabVIEW® driver, and Keithley’s
Test Script Builder software
development environment
APPLICATIONS
The high power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize
and test high power electronics. This SMU instrument can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power
semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies.
The Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with
precision voltage and current meters. It can be used as a:
•
•
•
•
•
•
•
Semiconductor characterization instrument
V or I waveform generator
V or I pulse generator
Precision power supply
True current source
Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
Precision electronic load
High power System SourceMeter SMU instrument
50A, High Power System
SourceMeter® SMU Instrument
+50A
+20A
+10A
+5A
0A
–5A
–10A
DC and
Pulse
Pulse
only
–20A
• Power semiconductor,
HBLED, and optical device
characterization and testing
• Solar cell characterization
and testing
• Characterization of GaN, SiC, and
other compound materials and
devices
• Semiconductor junction
temperature characterization
• High speed, high precision
digitization
• Electromigration studies
• High current, high power
device testing
–50A
–40V
–20V
–10V
0V
+10V
+20V
+40V
The Model 2651A can source or sink up to ±40V and ±50A.
Two Measurement Modes: Digitizing or Integrating
Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects,
with the two measurement modes in the Model 2651A. Each mode is defined by its independent
analog-to-digital (A/D) converters.
The Digitizing Measurement mode enables 1µs per point measurements. Its 18-bit A/D converters
allow you to precisely measure transient characteristics. For more accurate measurements, use its
Integrating Measurement mode, which is based on 22-bit A/D converters.
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SMU INSTRUMENTS
High power System SourceMeter SMU instrument
2651A
50A, High Power System
SourceMeter® SMU Instrument
unit can pulse up to 50A; combine two units
to pulse up to 100A.
2651A
Expansion Capabilities
Through TSP-Link Technology technology, multiple Model 2651As and selected Series 2600B
SMU instruments can be combined to form a
larger integrated system with up to 64 channels.
Precision timing and tight channel synchronization are guaranteed with built-in 500ns trigger
controllers. True SMU instrument-per-pin testing
is assured with the fully isolated, independent
channels of the SourceMeter SMU instruments.
High Power System
SourceMeter® SMU
Instrument
Accessories Supplied
2651A-KIT-1A: Low Impedance
Cable Assembly (1m)
CS-1592-2: High Current
Phoenix Connector (male)
CS-1626-2: High Current
Phoenix Connector (female)
CA-557-1: Sense Line
Cable Assembly (1m)
7709-308A: Digital I/O Connector
CA-180-3A: TSP-Link/Ethernet Cable
Documentation CD
Software Tools and Drivers CD
2651A
2651A
TSP-Link
Screw Terminal Connector Kit
Component Charaterization Software
Rack Mount Kit
Test Socket Kit
Two A/D converters are used with each
measurement mode (one for current and the
other for voltage), which run simultaneously for
accurate source readback that does not sacrifice
test throughput.
7
60
6
50
40
Current (A)
Voltage (V)
5
4
30
3
20
2
10
1
0
0
25
50
75
100
125
150
175
Keithley’s TSP and TSP-Link Technologies
enable true SMU-per-pin testing without
the power and/or channel limitations of a
mainframe-based system.
Also, when two Model 2651As are connected in
parallel with TSP-Link Technology, the current
range is expanded from 50A to 100A. When two
units are connected in series, the voltage range
is expanded from 40V to 80V. Built-in intelligence simplifies testing by enabling the units
to be addressed as a single instrument, thus
creating an industry-best dynamic range (100A
to 1pA). This c­ apability enables you to test a
much wider range of power semiconductors and
other devices.
0
200
60
Time (µs)
Volts
26xxB
LXI or GPIB
to PC
Controller
Accessories Available
2600-KIT
ACS-BASIC
4299-6
8011
Up to
100A
Current
High Speed Pulsing
The Model 2651A minimizes the unwanted
effects of self heating during tests by accurately
sourcing and measuring pulses as short as
100μs. Additional control flexibility enables you
to program the pulse width from 100μs to DC
and the duty cycle from 1% to 100%. A single
40
Id (A)
SMU INSTRUMENTS
50
The dual digitizing A/D converters sample at
up to 1μs/point, enabling full simultaneous
characterization of both current and
voltage waveforms.
Vgs = 2.01V
Vgs = 2.25V
Vgs = 2.50V
Vgs = 2.75V
Vgs = 3.00V
Vgs = 3.25V
Vgs = 3.51V
30
20
10
0
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
0.020
0.018
Id = 10A
Id = 20A
Id = 30A
Id = 40A
Id = 50A
0.016
0.014
Rds (ohms)
Ordering Information
0.012
0.010
0.008
0.006
0.004
0.002
0.000
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
6.5
Vgs (V)
1μV measurement resolution and current
sourcing up to 50A (100A with two units)
enable low-level Rds measurements to
support next-generation devices.
Standard Capabilities of Series
2600B SMU Instruments
Each Model 2651A includes all the features and
capabilities provided in most Series 2600B SMU
instruments, such as:
• Ability to be used as either a bench-top
I-V characterization tool or as a building
block component of multiple-channel I-V
test systems
• TSP Express software to quickly and
easily perform common I-V tests without
programming or installing software
• ACS Basic Edition software for semiconductor
component characterization (optional).
ACS Basic now features a Trace mode for
generating a suite of characteristic curves.
• Keithley’s Test Script Processor (TSP®)
Technology, which enables creation of
custom user test scripts to further automate
testing, and also supports the creation of
programming sequences that allow the
instrument to operate asynchronously
without direct PC control.
• Parallel test execution and precision
timing when multiple SMU instruments are
connected together in a system
• LXI compliance
• 14 digital I/O lines for direct interaction with
probe stations, component handlers, or other
automation tools
• USB port for extra data and test program
­storage via USB memory device
4.0
Vds (V)
Precision measurements to 50A (100A with
two units) enable a more complete and
accurate characterization.
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A Greater Measure of Confidence
High power System SourceMeter SMU instrument
High power System SourceMeter SMU instrument
2651A
2651A
50A, High Power System
SourceMeter® SMU Instrument
Specification Conditions
VOLTAGE ACCURACY SPECIFICATIONS 1, 2
SOURCE
Range
100.000 mV
1.00000 V
10.0000 V
20.0000 V
40.0000 V
Programming
Resolution
  5 μV
  50 μV
500 μV
500 μV
500 μV
Accuracy
±(% reading + volts)
0.02% + 500 μV
0.02% + 500 μV
0.02% +    5 mV
0.02% +    5 mV
0.02% +   12 mV
MEASURE
Noise (Vpp) (typical)
0.1 Hz to 10 Hz
100 μV
500 μV
  1 mV
  1 mV
  2 mV
Default
Display
Resolution
  1 μV
  10 μV
100 μV
100 μV
100 μV
Noise (Ipp) (typical)
0.1Hz to 10Hz
  50 pA
250 pA
500 pA
  5 nA
  10 nA
500 nA
  1 μA
300 μA
300 μA
500 μA
500 μA
N/A
Default
Display
Resolution
  1 pA
  10 pA
100 pA
  1 nA
  10 nA
100 nA
  1 μA
  10 μA
  10 μA
100 μA
100 μA
100 μA
Integrating ADC Accuracy 3
±(% reading + volts)
0.02% + 300 μV
0.02% + 300 μV
0.02% +    3 mV
0.02% +    5 mV
0.02% +   12 mV
High-Speed ADC Accuracy 4
±(% reading + volts)
0.05% + 600 μV
0.05% + 600 μV
0.05% +    8 mV
0.05% +    8 mV
0.05% +   15 mV
CURRENT ACCURACY SPECIFICATIONS 5
SOURCE
Range
100.000 nA
1.00000μA
10.0000μA
100.000μA
1.00000 m A
10.0000 m A
100.000 m A
1.00000 A
5.00000 A
10.0000 A
20.0000 A
50.0000 A 6
Programming
Resolution
2pA
20pA
200pA
2nA
20nA
200nA
2μA
200μA
200μA
500μA
500μA
2 mA
Accuracy
±(% reading + amps)
0.1  % +500 pA
0.1  % + 2 nA
0.1  % + 10 nA
0.03% + 60 nA
0.03% +300 nA
0.03% + 8μA
0.03% + 30μA
0.08% +3.5 mA
0.08% +3.5 mA
0.15% + 6 mA
0.15% + 8 mA
0.15% + 80 mA
MEASURE
Integrating ADC Accuracy 3
±(% reading + amps)
0.08% + 500 pA
0.08% + 2 nA
0.08% + 8 nA
0.02% + 25 nA
0.02% + 200 nA
0.02% + 2.5 µA
0.02% + 20 µA
0.05% + 3 mA
0.05% + 3 mA
0.12% + 6 mA
0.08% + 8 mA
0.05% + 50 mA 7
Model 2651A specifications
Source and measurement accuracies are specified at the Model 2651A terminals under
these conditions:
• 23° ±5°C, <70 percent relative humidity
• After two-hour warm-up
• Speed normal (1 NPLC)
• A/D autozero enabled
• Remote sense operation or properly zeroed local operation
• Calibration period: One year
High-Speed ADC Accuracy 4
±(% reading + amps)
0.08% + 800 pA
0.08% + 4 nA
0.08% + 10 nA
0.05% + 60 nA
0.05% + 500 nA
0.05% + 10 µA
0.05% + 50 µA
0.05% + 5 mA
0.05% + 5 mA
0.12% + 12 mA
0.08% + 15 mA
0.05% + 90 mA 8
NOTES
1. Add 50µV to source accuracy specifications per volt of HI lead drop.
2. For temperatures 0° to 18°C and 28° to 50°C, accuracy is degraded by ±(0.15 × accuracy specification)/°C.
High-capacitance mode accuracy is applicable at 23° ±5°C only.
3. Derate accuracy specification for NPLC setting <1 by increasing error term.
Add appropriate typical percent of range term for resistive loads using the table below.
NPLC Setting
100mV Range
1V to 40V Ranges
100nA Range
1µA to 100mA Ranges
1A to 20A Ranges
0.1
0.01
0.001
0.01%
0.08%
0.8 %
0.01%
0.07%
0.6 %
0.01%
0.1 %
1   %
0.01%
0.05%
0.5 %
0.01%
0.1 %
1.8 %
4. 18-bit ADC. Average of 1000 samples taken at 1µs intervals.
5. At temperatures 0° to 18°C and 28° to 50°C; 100nA to 10µA accuracy is degraded by ±(0.35 × accuracy specification)/°C.
100µA to 50A accuracy is degraded by ±(0.15 × accuracy specification)/°C.
High-capacitance mode accuracy is applicable at 23° ±5°C only.
6. 50A range accessible only in pulse mode.
7. 50A range accuracy measurements are taken at 0.008 NPLC.
8. Average of 100 samples taken at 1µs intervals.
SMU INSTRUMENTS
Model 2651A specifications
This document contains specifications and supplemental information for the Model 2651A High
Power System SourceMeter SMU instrument. Specifications are the standards against which the
Model 2651A is tested. Upon leaving the factory, the Model 2651A meets these specifications.
Supplemental and typical values are non-warranted, apply at 23°C, and are provided solely as
useful information.
Accuracy specifications are applicable for both normal and high-capacitance modes.
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A Greater Measure of Confidence
2651A
50A, High Power System
SourceMeter® SMU Instrument
Maximum output power: 202W maximum.
Source/Sink Limits 1:
Voltage: ±10.1V at ±20.0A, ±20.2V at ±10.0A, ±40.4V at ±5.0A 2.
Four-quadrant source or sink operation.
Current: ±5.05A at ±40V 2, ±10.1A at ±20V, ±20.2A at ±10V
Four-quadrant source or sink operation.
+50A
CAUTION: Carefully consider and configure the appropriate output-off state and source and
compliance levels before connecting the Model 2651A to a device that can deliver energy. Failure to
consider the output-off state and source and compliance levels may result in damage to the instrument or to the device under test.
+10A
+5A
0A
–5A
–10A
Pulse SPECIFICATIONS
Minimum programmable pulse width 3: 100μs. Note: Minimum pulse width for settled
source at a given I/V output and load can be longer than 100μs.
Pulse width programming resolution: 1μs.
Pulse width programming accuracy 3: ±5μs.
Pulse width jitter: 2μs (typical).
Pulse Rise Time (typical):
–20A
Current Range
50 A
50 A
50 A
20 A
50 A
20 A
10 A
 5A
R load
0.05 W
0.2  W
0.4  W
0.5  W
0.8  W
1   W
2   W
8.2  W
Rise Time (typical)
  26 μs
  57 μs
  85 μs
  95 μs
130 μs
180 μs
330 μs
400 μs
6
5
+30A
7
2
+20A
3
4
DC
1
Pulse
–30A
–50A
–40V
–20V
0V
–10V
Region
Maximums
  5 A at 40 V
10 A at 20 V
20 A at 10 V
30 A at 10 V
20 A at 20 V
10 A at 40 V
50 A at 10 V
50 A at 20 V
50 A at 40 V
Region
1
1
1
2
3
4
5
6
7
+10V
+20V
Maximum
Pulse Width 3
DC, no limit
DC, no limit
DC, no limit
  1 ms
  1.5 ms
  1.5 ms
  1 ms
330 μs
300 μs
+40V
Maximum
Duty Cycle 4
100%
100%
100%
 50%
 40%
 40%
 35%
 10%
  1%
NOTES
1. Full power source operation regardless of load to 30°C ambient. Above 30°C or power sink operation, refer to
“Operating Boundaries” in the Model 2651A Reference manual for additional power derating information.
2. Quadrants 2 and 4 power envelope is trimmed at 36V and 4.5A.
3. Times measured from the start of pulse to the start off-time; see figure below.
Pulse Level
90%
Start toff
Start ton
Bias Level
10%
10%
ton
toff
SMU INSTRUMENTS
4. Thermally limited in sink mode (quadrants 2 and 4) and ambient temperatures above 30°C. See power equations in the Model 2651A Reference Manual for more information.
The Model 2651A supports GPIB, LXI, Digital I/O, and Keithley’s TSP-Link Technology for multi-channel synchronization.
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Model 2651A specifications
Model 2651A specifications
DC POWER SPECIFICATIONS
50A, High Power System
SourceMeter® SMU Instrument
Noise (10Hz to 20MHz): <100mV peak-peak (typical), <30mV RMS (typical), 10V range with a
20A limit.
Overshoot:
Voltage: <±(0.1% + 10mV) (typical). Step size = 10% to 90% of range, resistive load, maximum
current limit/compliance.
Current: <±(0.1% + 10mV) (typical). Step Size = 10% to 90% of range, resistive load. See
Current Source Output Settling Time specifications for additional test conditions.
Range change overshoot:
Voltage: <300mV + 0.1% of larger range (for <20V ranges) (typical).
<400mV + 0.1% of larger range (for ≥20V ranges) (typical).
Overshoot into a 100kW load, 20MHz bandwidth.
Current: <5% of larger range + 360mV/R load (for >10μA ranges) (typical). Iout × R load = 1V.
Voltage source output settling time: Time required to reach within 0.1% of final value
after source level command is processed on a fixed range. 1
Range
 1V
10 V
20 V
40 V
Settling Time (typical)
<  70 μs
<160 μs
<190 μs
<175 μs
Current source output settling time: Time required to reach within 0.1% of final value
after source level command is processed on a fixed range. Values below for Iout × R load.
Current Range
R load
Settling time (typical)
<195 μs
20A
0.5 W
10A
<540 μs
1.5 W
5A
<560 μs
5W
1A
<  80 μs
1W
<  80 μs
100mA
10W
10mA
<210 μs
100 W
1mA
<300 μs
1kW
100μA
<500 μs
10kW
10μA
<  15 ms
100kW
1μA
<  35 ms
1MW
100nA
<110 ms
10MW
Transient response time:
10V and 20V Ranges: <70μs for the output to recover to within 0.1% for a 10% to 90% step
change in load.
40V Range: <110μs for the output to recover to within 0.1% for a 10% to 90% step change in load.
Guard offset voltage: <4mV, current <10mA.
Remote sense operating range 2:
Maximum Voltage between HI and SENSE HI: 3V.
Maximum Voltage between LO and SENSE LO: 3V.
Maximum impedance per source lead:
Maximum impedance limited by 3V drop by remote sense operating range.
Maximum resistance = 3V/source current value (amperes) (maximum of 1W per source lead).
3V = L di/dt.
Voltage output headroom:
5A Range: Maximum output voltage = 48.5V – (Total voltage drop across source leads).
10A Range: Maximum output voltage = 24.5V – (Total voltage drop across source leads).
20A Range: Maximum output voltage = 15.9V – (Total voltage drop across source leads).
Overtemperature protection: Internally sensed temperature overload puts unit in
standby mode.
Limit/compliance: Bipolar limit (compliance) set with single value.
Voltage 3: Minimum value is 10mV; accuracy is the same as voltage source.
Current 4: Minimum value is 10nA; accuracy is the same as current source.
Additional Measurement specifications
Contact Check 1
Speed
Fast
Medium
Slow
Maximum Measurement
Time to Memory
for 60Hz (50Hz)
1.1 ms (1.2 ms)
4.1 ms (5 ms)
36 ms (42 ms)
Accuracy (1 Year)
23° ±5°C
±(% reading + ohms)
5% + 15 W
5% +   5 W
5% +   3 W
NOTES
1. Includes measurement of SENSE HI to HI and SENSE LO to LO contact resistances.
Additional meter specifications
Maximum load impedance:
Normal Mode: 10nF (typical), 3μH (typical).
High-Capacitance Mode: 50μF (typical), 3μH (typical).
Common mode voltage: 250V DC.
Common mode isolation: >1GW, <4500pF.
Measure input impedance: >10GW.
Sense high input impedance: >10GW.
Maximum sense lead resistance: 1kW for rated accuracy.
Overrange: 101% of source range, 102% of measure range.
HIGH-CAPACITANCE mODE 1,2
Model 2651A specifications
Model 2651A specifications
ADDITIONAL SOURCE SPECIFICATIONS
Accuracy specifications 3: Accuracy specifications are applicable in both normal and highcapacitance modes.
Voltage Source Output Settling Time: Time required to reach within 0.1 % of final value
after source level command is processed on a fixed range. 4
Voltage Source
Range
 1V
10 V
20 V
40 V
Settling Time with
Cload = 4.7μF (typical)
  75 μs
170 μs
200 μs
180 μs
Mode change delay:
100μA Current Range and Above:
Delay into High-Capacitance Mode: 11ms.
Delay out of High-Capacitance Mode: 11ms.
1μA and 10μA Current Ranges:
Delay into High-Capacitance Mode: 250ms.
Delay out of High-Capacitance Mode: 11ms.
Measure input impedance: >10GW in parallel with 25nF.
Voltage source range change overshoot: <400mV + 0.1% of larger range (typical).
Overshoot into a 100kW load, 20MHz bandwidth.
NOTES
1. High-capacitance mode specifications are for DC measurements only and use locked ranges. Autorange is disabled.
2. 100nA range is not available in high-capacitance mode.
3. Add an additional 2nA to the source current accuracy and measure current accuracy offset for the 1µA range.
4. With measure and compliance set to the maximum current for the specified voltage range.
SMU INSTRUMENTS
2651A
NOTES
1. With measure and compliance set to the maximum current for the specified voltage range.
2. Add 50µV to source accuracy specifications per volt of HI lead drop.
3. For sink mode operation (quadrants II and IV), add 0.6% of limit range to the corresponding voltage source
accuracy specifications. For 100mV range add an additional 60mV of uncertainty. Specifications apply with sink
mode enabled.
4. For sink mode operation (quadrants II and IV), add 0.6% of limit range to the corresponding current limit
accuracy specifications. Specifications apply with sink mode enabled.
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A Greater Measure of Confidence
2651A
50A, High Power System
SourceMeter® SMU Instrument
Measurement Speed Specifications 1, 2
A/D Converter
Speed
0.001 NPLC
0.001 NPLC
0.01 NPLC
0.01 NPLC
0.1 NPLC
0.1 NPLC
1.0 NPLC
1.0 NPLC
HS ADC
HS ADC
Trigger Origin
Internal
Digital I/O
Internal
Digital I/O
Internal
Digital I/O
Internal
Digital I/O
Internal
Digital I/O
Measure
To Memory Using
User Scripts
20000 (20000)
8100 (8100)
4900 (4000)
3500 (3100)
580 (480)
550 (460)
59 (49)
58 (48)
38500 (38500)
12500 (12500)
Measure
To Gpib Using
User Scripts
9800 (9800)
7100 (7100)
3900 (3400)
3400 (3000)
560 (470)
550 (460)
59 (49)
58 (49)
18000 (18000)
11500 (11500)
Readings per
Second
Bursts per Second
 100
 500
1000
2500
5000
1,000,000
1,000,000
1,000,000
1,000,000
1,000,000
400
 80
 40
 16
  8
Source Measure
To Gpib Using
User Scripts
6200 (6200)
5100 (5100)
3200 (2900)
2900 (2600)
550 (460)
540 (450)
59 (49)
59 (49)
9500 (9500)
7000 (7000)
Source Measure
To Memory Using
Sweep API
12000 (12000)
11200 (11200)
4200 (3700)
4150 (3650)
560 (470)
560 (470)
59 (49)
59 (49)
14300 (14300)
13200 (13200)
TRIGGERING AND SYNCHRONIZATION
SPECIFICATIONS
High Speed ADC Burst MEASUREMENT RATES 3
Burst Length
(readings)
Source Measure
To Memory Using
User Scripts
7000 (7000)
5500 (5500)
3400 (3000)
3000 (2700)
550 (465)
540 (450)
59 (49)
59 (49)
10000 (10000)
7500 (7500)
Triggering:
Trigger In to Trigger Out: 0.5μs (typical).
Trigger In to Source Change 1: 10μs (typical).
Trigger Timer Accuracy: ±2μs (typical).
Source Change 1 After LXI Trigger: 280μs (typical).
Synchronization:
Single-Node Synchronized Source Change 1: <0.5μs (typical).
Multi-Node Synchronized Source Change 1: <0.5μs (typical).
Maximum SINGLE MEASUREMENT RATES (operations per
second) FOR 60Hz (50Hz)
A/D Converter
Speed
Trigger
Origin
Measure
To Gpib
Source
Measure
To Gpib
Source
Measure
Pass/Fail
To Gpib
0.001 NPLC
0.01  NPLC
0.1   NPLC
1.0   NPLC
Internal
Internal
Internal
Internal
1900 (1800)
1450 (1400)
450 (390)
58 (48)
1400 (1400)
1200 (1100)
425 (370)
57 (48)
1400 (1400)
1100 (1100)
425 (375)
57 (48)
NOTES
1. Fixed source range with no polarity change.
Maximum Measurement RANGE CHANGE RATE: >4000 per second for >10µA (typical).
Maximum SOURCE Range CHANGE RATE: >325 per second for >10µA, typical. When changing to or from a range ≥1A, maximum rate is >250 per second, typical.
COMMAND PROCESSING TIME: Maximum time required for the output to begin to change following the receipt of the smua.source.levelv or smua.source.leveli command. <1ms typical.
NOTES
SMU INSTRUMENTS
1. Tests performed with a Model 2651A on channel A using the following equipment: Computer hardware (Intel®
Pentium® 4 2.4GHz, 2GB RAM, National Instruments™ PCI-GPIB). Driver (NI-488.2 Version 2.2 PCI-GPIB).
Software (Microsoft® Windows® XP, Microsoft Visual Studio® 2010, VISA™ version 4.1).
2. Exclude current measurement ranges less than 1mA.
3. smua.measure.adc has to be enabled and the smua.measure.count set to the burst length.
1.888.KEITHLEY (U.S. only)
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A Greater Measure of Confidence
Source Measure
To Gpib Using
Sweep API
5900 (5900)
5700 (5700)
4000 (3500)
3800 (3400)
545 (460)
545 (460)
59 (49)
59 (49)
6300 (6300)
6000 (6000)
Model 2651A specifications
Model 2651A specifications
Maximum SWEEP OPERATION RATES (operations per second) FOR 60Hz (50Hz):
2651A
50A, High Power System
SourceMeter® SMU Instrument
SUPPLEMENTAL INFORMATION
To Host Computer
Node 1
Node 2
To Additional Nodes
Each Model 2651A has two TSP-Link connectors to make it easier to connect instruments
together in sequence.
Once source-measure instruments are interconnected through the TSP-Link expansion interface,
a computer can access all the resources of each source-measure instrument through the host
interface of any Model 2651A.
A maximum of 32 TSP-Link nodes can be interconnected. Each source-measure instrument
consumes one TSP-Link node.
TIMER: Free-running 47-bit counter with 1MHz clock input. Resets each time instrument power is
turned on. If the instrument is not turned off, the timer is reset to zero every 4 years.
Timestamp: TIMER value is automatically saved when each measurement is triggered.
Resolution: 1µs.
Timestamp Accuracy: ±100ppm.
+5V Pin
600mA
Solid State
Fuse
Digital I/O Pin
100W
+5VDC
(on DIGITAL I/O
connector)
5.1kW
(on DIGITAL I/O
connector)
Read by
firmware
Written by
firmware
GND Pin
(on DIGITAL I/O
connector)
Rear Panel
Connector: 25-pin female D.
Input/Output Pins: 14 open drain I/O bits.
Absolute Maximum Input Voltage: 5.25V.
Absolute Minimum Input Voltage: –0.25V.
Maximum Logic Low Input Voltage: 0.7V, +850μA max.
Minimum Logic High Input Voltage: 2.1V, +570μA.
Maximum Source Current (flowing out of digital I/O bit): +960μA.
Maximum Sink Current At Maximum Logic Low Voltage (0.7): –5.0mA.
Absolute Maximum Sink Current (flowing into digital I/O pin): –11mA.
5V Power Supply Pin: Limited to 250mA, solid-state fuse protected.
Output Enable Pin: Active high input pulled down internally to ground with a 10kW
resistor; when the output enable input function has been activated, the Model 2651A
channel will not turn on unless the output enable pin is driven to >2.1V (nominal
current = 2.1V/10kW = 210μA).
IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status model
topology.
RS-232: Baud rates from 300bps to 115200bps. Programmable number of data bits, parity
type, and flow control (RTS/CTS hardware or none). When not programmed as the
active host interface, the Model 2651A can use the RS-232 interface to control other
instrumentation.
Ethernet: RJ-45 connector, LXI, 10/100BT, Auto MDIX.
LXI compliance: LXI Class C 1.2.
Total Output Trigger Response Time: 245μs minimum, 280μs (typical), (not specified)
maximum.
Receive Lan[0-7] Event Delay: Unknown.
Generate Lan[0-7] Event Delay: Unknown.
Expansion interface: The TSP-Link Technology expansion interface allows TSP-enabled
instruments to trigger and communicate with each other.
Cable Type: Category 5e or higher LAN crossover cable. 3 meters maximum between each
TSP-enabled instrument.
USB: USB 2.0 host controller.
Power supply: 100V to 250V AC, 50Hz to 60Hz (autosensing), 550VA maximum.
Cooling: Forced air; side and top intake and rear exhaust.
Warranty: 1 year.
EMC: Conforms to European Union EMC Directive.
Safety: UL listed to UL61010-1:2004. Conforms to European Union Low Voltage Directive.
Dimensions: 89mm high × 435mm wide × 549mm deep (3.5 in. × 17.1 in. × 21.6 in.).
Bench Configuration (with handle and feet): 104mm high × 483mm wide × 620mm
deep (4.1 in. × 19 in. × 24.4 in.).
Weight: 9.98kg (22 lbs).
Environment: For indoor use only.
Altitude: Maximum 2000 meters above sea level.
Operating: 0° to 50°C, 70% relative humidity up to 35°C. Derate 3% relative humidity/°C,
35° to 50°C.
Storage: –25° to 65°C.
1.888.KEITHLEY (U.S. only)
www.keithley.com
A Greater Measure of Confidence
Model 2651A specifications
Keypad Operations:
Change host interface settings.
Save and restore instrument setups.
Load and run factory and user defined test scripts that prompt for input and send results to
the display.
Store measurements into dedicated reading buffers.
PROGRAMMING: Embedded Test Script Processor (TSP®) scripting engine is accessible from any
host interface.
Responds to individual instrument control commands.
Responds to high speed test scripts comprised of instrument control commands and Test Script
Language (TSL) statements (for example, branching, looping, and math).
Able to execute high speed test scripts stored in memory without host intervention.
Minimum User Memory Available: 16MB (approximately 250,000 lines of TSP code).
Test Script Builder: Integrated development environment for building, running, and
managing TSP scripts. Includes an instrument console for communicating with any TSP enabled
instrument in an interactive manner. Requires:
VISA (NI-VISA included on CD),
Microsoft® .NET Framework (included on CD),
Keithley I/O Layer (included on CD),
Intel® Pentium III 800MHz or faster personal computer,
Microsoft Windows® 2000, XP, Vista®, or 7.
TSP Express (embedded): Tool that allows users to quickly and easily perform common I-V tests
without programming or installing software. To run TSP Express, you need:
Java™ Platform, Standard Edition 6,
Microsoft Internet Explorer®, Mozilla® Firefox®, or another Java-compatible web browser.
Software Interface: TSP Express (embedded), direct GPIB/VISA, read/write with Microsoft
Visual Basic®, Visual C/C++®, Visual C#®, LabVIEW™, CEC TestPoint™ Data Acquisition
Software Package, NI LabWindows™/CVI, etc.
READING BUFFERS: Nonvolatile memory uses dedicated storage areas reserved for measurement
data. Reading buffers are arrays of measurement elements. Each element can hold the
following items:
Source setting (at the time the measurement was taken)
Measurement
Range information
Measurement status
Timestamp
Two reading buffers are reserved for each Model 2651A channel. Reading buffers can be filled
using the front panel STORE key and retrieved using the RECALL key or host interface.
Buffer Size, with timestamp and source setting: >60,000 samples.
Buffer Size, without timestamp and source setting: >140,000 samples.
SYSTEM EXPANSION: The TSP-Link expansion interface allows TSP-enabled instruments to
­trigger and communicate with each other. See figure below.
Digital I/O Interface:
SMU INSTRUMENTS
Model 2651A specifications
FRONT PANEL INTERFACE: Two-line vacuum fluorescent display (VFD) with keypad and
navigation wheel.
Display:
Show error messages and user defined messages. Display source and limit settings.
Show current and voltage measurements
View measurements stored in dedicated
(6½-digit to 4½-digit).
reading buffers.
GENERAL
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