4Gb: x16 DDR3 SDRAM Reduced tFAW Addendum

4Gb: x16 DDR3 SDRAM Reduced tFAW Addendum
Features
DDR3 SDRAM Reduced tFAW Addendum
MT41J256M16 – 32 Meg x 16 x 8 Banks
Features
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Options
Marking
• Configuration
– 256 Meg x 16
• FBGA package (Pb-free) – x16
– 96-ball (8mm x 14mm)
• Timing – cycle time
– 938ps @ CL = 14 (DDR3-2133)
• Reduced tFAW
– tFAW = 30ns1
• Operating temperature
– Commercial (0°C ≤ T C ≤ +95°C)
• Revision
VDD = V DDQ = 1.5V ±0.075V
1.5V center-terminated push/pull I/O
Differential bidirectional data strobe
8n-bit prefetch architecture
Differential clock inputs (CK, CK#)
8 internal banks
Nominal and dynamic on-die termination (ODT)
for data, strobe, and mask signals
Programmable CAS READ latency (CL)
Posted CAS additive latency (AL)
Programmable CAS WRITE latency (CWL) based on
tCK
Fixed burst length (BL) of 8 and burst chop (BC) of 4
(via the mode register set [MRS])
Selectable BC4 or BL8 on-the-fly (OTF)
Self refresh mode
TC of 0°C to 95°C
– 64ms, 8192 cycle refresh at 0°C to 85°C
– 32ms, 8192 cycle refresh at 85°C to 95°C
Self refresh temperature (SRT)
Write leveling
Multipurpose register
Output driver calibration
Notes:
256M16
HA
-093
J
None
:E
1. Standard DDR3-2133, 2KB page size, tFAW
specification is 35ns.
2. For complete device functionality and specifications, refer to the standard 4Gb DDR3
SDRAM data sheet found at www.micron.com. The information in this data
sheet supersedes the standard data sheet.
Table 1: Key Timing Parameters
Speed Grade
Data Rate (MT/s)
tFAW
Target tRCD-tRP-CL
-093
2133
30ns
14-14-14
tRCD
(ns)
tRP
13.09
(ns)
13.09
CL (ns)
13.09
Table 2: Addressing
Parameter
256 Meg x 16
Configuration
32 Meg x 16 x 8 banks
Refresh count
8K
Row addressing
32K (A[14:0])
Bank addressing
8 (BA[2:0])
Column addressing
1K (A[9:0])
Page size
2KB
PDF: 09005aef857c6ed1
4Gb_DDR3_SDRAM_tFAW.pdf - Rev. B 3/14 EN
1
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2013 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
4Gb: x16 DDR3 SDRAM Reduced tFAW Addendum
Features
Figure 1: DDR3 Part Numbers
Example Part Number:
MT41J256M16HA-093 J:E
-
MT41J
Configuration
Package
:
Speed
Revision
:E
Configuration
256 Meg x 16
Reduced tFAW
30ns tFAW
256M16
Package
96-ball 9mm x 14mm FBGA
Note:
Revision
Rev.
Mark
E
HA
J
Speed Grade
-093
tCK
= 0.938ns, CL = 14
1. Not all options listed can be combined to define an offered product. Use the part catalog search on
http://www.micron.com for available offerings.
FBGA Part Marking Decoder
Due to space limitations, FBGA-packaged components have an abbreviated part marking that is different from the
part number. For a quick conversion of an FBGA code, see the FBGA Part Marking Decoder on Micron’s Web site:
http://www.micron.com.
PDF: 09005aef857c6ed1
4Gb_DDR3_SDRAM_tFAW.pdf - Rev. B 3/14 EN
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2013 Micron Technology, Inc. All rights reserved.
4Gb: x16 DDR3 SDRAM Reduced tFAW Addendum
AC Timing Adjustments
AC Timing Adjustments
Table 3: Electrical Characteristics and AC Operating Conditions for Speed Extensions
Notes 1–8 apply to the entire table
DDR3-2133
Parameter
Symbol
Min
Max
Unit
Notes
–
ns
9
Command and Address Timing
Four ACTIVATE windows
Notes:
2KB page
size
1.
2.
3.
4.
5.
6.
7.
8.
9.
tFAW
30
AC timing parameters are valid from specified TC MIN to TC MAX values.
All voltages are referenced to VSS.
Output timings are only valid for RON34 output buffer selection.
The unit tCK (AVG) represents the actual tCK (AVG) of the input clock. The unit CK represents one clock cycle of the input clock, counting the actual clock edges.
AC timing and IDD tests may use a VIL-to-VIH swing of up to 900mV in the test environment, but input timing is still referenced to VREF (except tIS, tIH, tDS, and tDH use the
AC/DC trip points and CK, CK# and DQS, DQS# use their crossing points). The minimum
slew rate for the input signals used to test the device is 1 V/ns for single-ended inputs
(DQs are at 2V/ns for DDR3-1866 and DDR3-2133) and 2 V/ns for differential inputs in
the range between VIL(AC) and VIH(AC).
All timings that use time-based values (ns, µs, ms) should use tCK (AVG) to determine the
correct number of clocks (Table 3 (page 3) uses CK or tCK [AVG] interchangeably). In the
case of noninteger results, all minimum limits are to be rounded up to the nearest
whole integer, and all maximum limits are to be rounded down to the nearest whole
integer.
Strobe or DQSdiff refers to the DQS and DQS# differential crossing point when DQS is
the rising edge. Clock or CK refers to the CK and CK# differential crossing point when
CK is the rising edge.
This output load is used for all AC timing (except ODT reference timing) and slew rates.
The actual test load may be different. The output signal voltage reference point is
VDDQ/2 for single-ended signals and the crossing point for differential signals.
For these parameters, the DDR3 SDRAM device supports tnPARAM (nCK) = RU(tPARAM
[ns]/tCK[AVG] [ns]), assuming all input clock jitter specifications are satisfied. For example, the device will support tnRP (nCK) = RU(tRP/tCK[AVG]) if all input clock jitter specifications are met. This means that for DDR3-800 6-6-6, of which tRP = 5ns, the device will
support tnRP = RU(tRP/tCK[AVG]) = 6 as long as the input clock jitter specifications are
met. That is, the PRECHARGE command at T0 and the ACTIVATE command at T0 + 6 are
valid even if six clocks are less than 15ns due to input clock jitter.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
www.micron.com/productsupport Customer Comment Line: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization sometimes occur.
PDF: 09005aef857c6ed1
4Gb_DDR3_SDRAM_tFAW.pdf - Rev. B 3/14 EN
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2013 Micron Technology, Inc. All rights reserved.
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