Read more - Inovenso

Read more - Inovenso
INTRODUCTION
We believe that every laboratory working in the field of nanotechnology needs an
SEM, therefore we would like to introduce to you our IEM series of SEM. In short space of
time, our device that is the size of an old computer will prove its effectiveness, and will
help you achieve a significant step in your research. The advantage of the images obtained by SEM lies in the high magnification factor: you will be able to magnify an image by
up to 150,000 times which will enable you to conduct analyses up to a nanoscale using
different detectors such as BSE, SE and EDS (X-ray detector). The SEM can be used in many
areas and there is no restriction to analyses on samples. Another important factor to purchase our SEM is to avoid waiting the annoying time for obtaining images from a nearby
facility, instead of that your images can be available in an unbelievable short time. Our
SEMs are easy to operate and your employees or students can use it without any waste of
time in a special training.
İnovenso Team
SEM
Why
?
Quick and simple installation
and no maintenance needed
1
3 Times More affordable
than other SEMs
2
Obtaining results in less than
4 minutes
3
Magnification range:
x20 ~ x150,000
4
5 nanometer resolution
5
Easy Navigation with the
User-Friendly Software
6
IEM 10
IEM 10
Magnification Up To x 100,000
Auto Stage : X, Y, T Axis
Click & Move Stage Control
Auto Function : Filament Memory, Focus, Contrast, Brightness
High Definition Image : 5120 X 3840 Pixel
Specifica�ons
Magnification
Acc Voltage
Electron Gun
Detector
Stage
: x20 ~ x100,000 (Efficient: ~x50,000)
: 1 ~ 30 kV (1kV increments)
: Tungsten Filament (W)
:SE Detector
: Auto Stage (X: 35mm,Y: 35mm,T: 0 to 45o)
Manual Stage (Z: 5 to 50mm)
Image Shift
: X, Y, R(Rotation)
Operating System : Microsoft Windows 7
Dimensions
: 400(W) x 600(L) x 550(H) mm
Weight
: 85Kg
Stage Position
Users can easily locate the sample on the stage
Auto Focus & Fine Focus
Auto focus function makes the operation easier and clearer images can be obtained even
at the higher magnifications
Click & Move
By applying the auto stage, stage is controlled simply with a mouse click
Filament Memory:
Filament’s saturation point is automatically stored and activated
01
IEM 10 - IEM 10+
IEM 10+
IEM 10+
Magnification Up To x 100,000
Auto Stage : X, Y, T Axis
Click & Move Stage Control
Auto Function : Filament Memory, Focus, Contrast, Brightness
High Definition Image : 5120 X 3840 Pixel
Thermo EDS Detector: 133 eV at Mn, B(5) ~ U(92)
Specifica�ons
Magnification
Acc Voltage
Electron Gun
Detectors
Stage
: x20 ~ x100,000 (Efficient: ~x50,000)
: 1 ~ 30 kV (1kV increments)
: Tungsten Filament (W)
:SE and EDS Detectors
: Auto Stage (X: 35mm,Y: 35mm,T: 0 to 45o)
Manual Stage (Z: 5 to 50mm)
Image Shift
: X, Y, R(Rotation)
Operating System :Microsoft Windows 7
Dimensions
: 400(W) x 600(L) x 550(H) mm
Weight
: 95Kg
Rapid EDS Analysis
Point and shoot analysis with NORAN System 7 software uses standardless quantitative
analysis to enable rapid identification of various regions within a material.
EDS Analysis with NORAN System 7 Spectral Imaging
The UltraDry Compact EDS detector provides outstanding elemental mapping within few minutes. With Spectral
Imaging, where a full EDS spectrum is stored at every pixel, samples can be analyzed after they have been removed
from the microscope. NORAN System 7 tools provide several analytical methods for the best results.
- Elemental Mapping
- Extracted Linescans
-E
02
IEM 11
IEM 11
High Quality Images (5nm resolution)
Magnification Up To 150,000x
Easy Navigation with the “Navigation Mode”
Precise Control with a Joystick and the “Driving Mode”
Combined SE and BSE Images
Low Energy Consumption
Intuitive User Interface
Specifica�ons
Magnification
Acc Voltage
Electron Gun
Detectors
Stage
: x20 ~ x100,000 (Efficient: ~x80,000)
: 1 ~ 30 kV (1kV increments)
: Tungsten Filament (W)
:SE and BSE Detectors
: Auto Stage (X: 35mm,Y: 35mm,T: 0 to 45o)
Manual Stage (Z: 5 to 50mm)
Image Shift
: X, Y, R(Rotation)
Operating System :Microsoft Windows 7
Dimensions
: 400(W) x 600(L) x 550(H) mm
Weight
: 85Kg
Removable BSE Detector
By applying 4-channel BSE detector, composition and topography functions are available. These functions are optional
and can be opted out.
BSE : Composition
Material : Alloy Metal
03 03
BSE : Topography
Material : Alloy Metal
IEM 11
Low Voltage Analysis
Information on the morphology of a sample can be obtained with voltage ranging from 1 to 30kV.
ACC.Voltage : 20kV / SE Image / Mag : x50,000
ACC.Voltage : 5 kV / SE Image / Mag : x50,000
Driving Mode
Combined Signaling
2-axes stage motion, magnification, and focus can be
easily motorized and controlled with a joystick.
SE and BSE can be detected separately and together.
ACC.Voltage : 20kV
SE + BSE Image
Material : Alloy Metal
Highest Resolution
Navigation Mode
Provides high quality images (5nm resolution, Max
accelerating voltage : 30kV)
By loading seven samples simultaneously into a multi
holder, samples can be easily located with the help of a
mini map, sample area, and a live display.
Mini
Map
Live
Display
Sample
Area
ACC. Voltage : 30kV / SE Image / Mag : x100,000
Multi Holder
04
IEM 11+
IEM 11+
High Quality Images (5nm resolution)
Magnification Up To 150,000x
Easy Navigation with the “Navigation Mode”
Precise Control with a Joystick and the “Driving Mode”
Combined SE and BSE Images
Low Energy Consumption
Intuitive User Interface
Oxford:130eV at Mnk, C(6) ~ U(92) / EDAX:133eV at Mnk,
Be(4) ~ U(92)
Specifica�ons
Magnification
Acc Voltage
Electron Gun
Detectors
EDS
05
: x20 ~ x150,000 (Efficient: ~x80,000)
: 1 ~ 30kV (1kV increments)
: Tungsten Filament (W)
: SE and BSE Detectors
: Oxford:130eV at Mnk, C(6) ~ U(92)
EDAX:133eV at Mnk, Be(4) ~ U(92)
Stage
: Auto Stage (X: 35mm, Y: 35mm, T: 0 to 45o)
Manual Stage (Z: 5 to 50mm)
Image Shift
: X, Y, R(Rotation)
Operating System : Microsoft Windows 7
Dimension
: 400(W) X 600(L) X 550(H) mm
Weight
: 95kg
Brand : Oxford
Brand : EDAX
- Tru-Q Analysis Engine: Accurate Result By Multi
Algorithm
- Multilingual Operation
- Fast & Easy Analysis With Flow Chart Style Menu
- Diverse Element Analysis Functions: Point & ID, Line
Scan, Mapping, Line Overlap & Background Correction
- Quantitative Mapping (QuantLineScan, QuantMap)
- Highest Performance SDD
- Sensor Size: 30mm2
- High Quality Light Element Analysis: Be(4) ~ Am(95)
- Diverse Element Analysis Functions: Point&ID
Line Scan, Mapping
IEM 11+
Oxford
- Report & Data Save
Various report templates are provided. Users can generate
a report with the Report Generate function. Data can be
saved, copied, printed, and e-mailed directly.
- LineScan
Linescan determines elemental concentration variations
along a line defined by the users. Linescans are corrected
for peak overlaps and any false variations due to X-ray
background.
- Available in Various Languages
The program is offered in various languages including
English, Japanese, Chinese simplified,
Russian, French, Korean and Portuguese.
- Point & ID
Spectrum that shows elemental composition can be
acquired from multiple points and areas.
EDAX
- Outstanding Light Element Performance
Silicon nitride window improves performance for
light elements at low energies.
- EDS Reporting
The TEAMTM EDS Smart Data Management system for
SEM achieves new levels of ease and flexibility with
simplified file management and dynamic reporting.
- Fast, Efficient Results for Industrial Needs
All results can be reviewed anytime. Spectrum,
microelement detection, quantitative mapping are
construed accurately.
06
WINDOW FOR NANO WORLD
WITH SEMOSCOPE
-Simple Operation
-Compact Rotary Pump
-Suitable for Metal Targets
(Au,Pt,Pd,Cr,Pt-Pd,Cu,Ni)
Target
Target Size
Power
Au (Standard)
50mm[Dia]
AC110-240V, 50 / 60Hz, 50W
(Except Rotary Pump)
Ionization Current
Chamber Size
Dimension
0~9mA
100mm[Dia]
420(W)x220(D)x230(H)mm
-Suitable for Liquid or Biological Samples
-Cool Stage Temperature : -25oC to 50oC
-Temperature Resolution : ±0.1oC
-Temperature Accuracy : ±1oC
-Specimen Holder Size : 18mm[Dia]
-Vacuum Feed Through Flange
-Onion Skin
without Cool Stage
07
-Onion Skin
with Cool Stage
Suitable for Non-Conductive Samples
BSE Required
Coating Not Required
Vacuum Condition : 100pa to 1pa
-High Vacuum SE Image
Primary Electron Beam
Objective Lens
BSE Detector
e-
Gas Molecules
Non-conductive Sample
-Low Vacuum BSE Image
4 Channel Solid State Type : 4 Segment Silicon PIN Diode
Excellent Composition and Topography Functions
Combined SE and BSE Images
Synergistic Use of BSE Detector and LV Mode
-SE Image of Film Surface
-BSE Image of Film Surface
08
Appl�cat�ons
Iron Plate
Glass
LED
09
Filter
Tire
Engine Part
Bearing
Chip Cross-Section
Si Wafer
Wire Bonding
Chip Layer
Solder Ball
Package Material
Fiber
ZrO2
Silver
TiO2
CNT
Lithium
Carbon
Silica
PCB
Appl�cat�ons
Appl�cat�ons
Grain Boundary
Crack
Wire
Implant
Heater
AI Deposition
Alloy Metal
Drill
Virus
Bacteria
Fungus
Cells
Patch
Tablet
Implant
Coffee
Paint
Water Filter
Painting
Wood
Iron Plate
Stone
Sand
10
Comparison Table
Items/Model
IEM-10+
IEM-11+
IEM -10
IEM-11
Resolution SE
5.0nm at 30kV
20nm at 30kV
Magnification
x20 ~ x150,000
x20 ~ x100,000
~ x80,000
~ x50,000
Efficient
Magnification
Acceleration
Voltage
Vacuum Mode
EDS
1 ~ 30 kV
High Vacuum
Low Vacuum (Optional)
External
(Optional)
Integrated
(Standard)
External
(Optional)
Maximum
Specimen Size
60mm in diameter
Stage
3-Axes Motorized
X
0~35mm
Y
0~35mm
T
0~45o
Z
5~50mm (Manual)
R
360o (Raster)
Observation
Area
Maximum
Height
40mm in diameter
Integrated
(Standard)
45mm
Electron Gun
Pre-centered Cartridge
Source
Tungsten
SE
Detector
BSE(Standard)
BSE(Optional)
Mouse
Control
Keyboard
Joystick
Auto Focus
Auto Brightness & Contrast
Auto lmage
Adjustment
Auto Filament
Auto Start
Navigation View
Measurement Tool
Special Multi Holder
Remote Control
Signal Mixing (SE+BSE)
Dual Display(SE/BSE)
Special Features
BSE(Compo,Topo)
Line Profile
Image Process
Measurement Tool
Remote Control
EDS
EDS
BSED
Options
Low Vacuum
Cool Stage
11
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