TECHSPEC® COMPACT INSTRUMENTATION IMAGING LENS #85

TECHSPEC® COMPACT INSTRUMENTATION IMAGING LENS #85
TECHSPEC® COMPACT
INSTRUMENTATION
IMAGING LENS
#85-367 • 35mm FL • f/8
TECHSPEC® COMPACT INSTRUMENTATION IMAGING LENS
Featuring low lens-to-lens variation and a broadband anti-reflection (AR)
coating for maximum light transmission, TECHSPEC® Compact Instrumentation Imaging Lenses are ideal for a wide range of applications.
An adjustable, lockable focus enables setting the best focus position
prior to integrating into instrumentation, avoiding future adjustments.
The wide range of fixed aperture options ensures maximum flexibility
of resolution, throughput, and depth of field. These compact lenses are
designed specifically for volume integration into applications such as
analytical medical devices, including benchtop-based blood analyzers.
For customized f/# versions to best suit your instrumentation application needs and to discuss volume requirements, please contact us.
Focal Length:
Minimum Working Distance :
1
Focus Range :
35mm
Aperture (f/#):
f/8, Fixed
165mm
Magnification Range:
0X - 0.22X
165mm - ∞
1
Length at Near Focus:
38.0mm
Length at Far Focus:
30.1mm
Filter Thread:
Distortion :
Object Space NA :
No. of Elements (Groups):
7 (6)
AR Coating:
2/3”
Camera Mount:
0.0067
2
M25.5 x 0.5
Max Sensor Format:
<0.3%
2
425-675nm BBAR
Weight:
C-mount
45g
Sensor Size
1/4”
1/3”
1/2. 5”
1/2”
1/1. 8”
2/3”
1”
4/3”
Field of View3
16.1mm - 5.9˚
21.4mm - 7.8˚
25.4mm - 9.3˚
28.5mm - 10.4˚
32.0mm - 11.7˚
39.3mm - 14.3˚
NA
NA
1. From front of housing 2. Fig 1 Distance: 300mm
3. Horizontal FOV on standard 4:3 sensor format
Specifications subject to change
Figure 2: Relative illumination (center to corner)
In both plots, field points corresponding to the image circle of common sensor formats are included. Plots represent theoretical values from lens design software. Actual lens performance varies due to
manufacturing tolerances.
www.edmundoptics.com
® COPYRIGHT 2014 EDMUND OPTICS, INC. ALL RIGHTS RESERVED
Figure 1: Distortion at the maximum sensor format. Postive values correspond to pincushion
distortion, negative values correspond to barrel distortion.
TECHSPEC® COMPACT
INSTRUMENTATION
IMAGING LENS
#85-367 • 35mm FL • f/8
TECHSPEC® COMPACT INSTRUMENTATION IMAGING LENS
TECHSPEC® COMPACT INSTRUMENTATION IMAGING LENS
MTF & DOF: f/8
WD: 300mm
Figure 3: Image space polychromatic diffraction FFT Modulation Transfer Function (MTF) for λ = 486nm to 656nm. Included are Tangential and Sagittal
values for field points on center, at 70% of full field and at the maximum sensor format. Solid black line indicates diffraction limit determined by f/#defined aperture. Frequencies corresponding to the Nyquist resolution limit of pixel sizes are indicated.
Plots represent theoretical values from lens design software. Actual lens performance varies due to manufacturing tolerances.
www.edmundoptics.com
® COPYRIGHT 2014 EDMUND OPTICS, INC. ALL RIGHTS RESERVED
Figure 4: Polychromatic diffraction through-focus MTF at 20 linepairs/mm (image space). Contrast is plotted to two times the focus distance. Note object
spatial frequency changes with working distance.
TECHSPEC® COMPACT
INSTRUMENTATION
IMAGING LENS
#85-367 • 35mm FL • f/8
TECHSPEC® COMPACT INSTRUMENTATION IMAGING LENS
MTF & DOF: f/8
WD: 750mm
Figure 5: Image space polychromatic diffraction FFT Modulation Transfer Function (MTF) for λ = 486nm to 656nm. Included are Tangential and Sagittal
values for field points on center, at 70% of full field and at the maximum sensor format. Solid black line indicates diffraction limit determined by f/#defined aperture. Frequencies corresponding to the Nyquist resolution limit of pixel sizes are indicated.
Plots represent theoretical values from lens design software. Actual lens performance varies due to manufacturing tolerances.
www.edmundoptics.com
® COPYRIGHT 2014 EDMUND OPTICS, INC. ALL RIGHTS RESERVED
® COPYRIGHT 2014 EDMUND OPTICS, INC. ALL RIGHTS RESERVED
Figure 6: Polychromatic diffraction through-focus MTF at 20 linepairs/mm (image space). Contrast is plotted to two times the focus distance. Note object
spatial frequency changes with working distance.
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