IQS-5240S-P/BP Optical Spectrum Analyzers

Feature(s) of this product is/are protected by one or more of : US patents 6,612,750; US patents 8,373,852; US patent 6,636,306 and equivalent patents pending and granted in other countries;
US patent 8,358,930 and equivalent patents pending and granted in other countries; US patent 8,787,753; US patent 8,364,034 and equivalent patents pending and granted in other countries;
US patent 9,438,336 and equivalent patents pending and/or granted in other countries; patent appl. US 2014/0086574 A1; and US design patent D737,429.
Highly accurate, easy-to-use intelligent optical spectrum analyzers (OSAs) for current
and next-generation networks.
KEY FEATURES
Pol-Mux OSNR measurement capability for 40G and
100G coherent signals, compliant with the IEC 61282-12
standard (under revision)
Compliant with Recommendation ITU-T G.697
Fast, accurate scans—no compromise on dynamic range
or resolution bandwidth
Flexibility to analyze WDMs, EDFAs, drift, spectral
transmittance, FP and DFB lasers
GPIB or LAN remote control using SCPI commands
Automatic impairment identification for faster
troubleshooting
One-button operation for easy setup and automatic
measurement
COMPLEMENTARY PRODUCTS
Platform
IQS-600
High-Speed Multiservice Test Module
IQS-88100NGE Power Blazer
SPEC SHEET
IQS-5240S-P/BP Optical
Spectrum Analyzers
IQS-5240S-P/BP Optical Spectrum Analyzers
UNIQUE POL-MUX OSNR MEASUREMENT TECHNOLOGY
OSNR has long been recognized as a key performance indicator in wavelength-division multiplexing (WDM) networks, because
it provides a multichannel assessment of signal quality in a very short period of time. In addition, OSNR can predict bit error rate
(BER) within just a few minutes, while typical BER tests must run for hours or days.
The IEC 61280-2-9 standard defines OSNR measurement as the power ratio between the
signal power and the noise at half the distance between the peaks. However, in ROADM or
40 Gbit/s systems, this method may lead to incorrect results, because the noise level between
the peaks is no longer directly correlated with the noise level at the channel wavelength.
EXFO’s in-band OSNR is the answer to this challenge.
For Pol-Mux signals at 40G and 100G, neither the IEC nor the in-band method work. This calls for a new measurement method:
Pol-Mux OSNR.
FIRST POL-MUX OSA IN THE MARKET
EXFO’s Pol-Mux OSA is the first third-party instrument for Pol-Mux OSNR measurements that is not limited to any specific
system vendor. The new commissioning assistant, which is the key feature of the new Pol-Mux OSA, is perfect for Pol-Mux OSNR
measurements during turn-up. Based on the channel shutdown method, it provides highly accurate amplified spontaneous emission
(ASE) OSNR measurements.
The commissioning assistant can be utilized after the user has first taken a measurement at the receiver with all of the channels turned
on, and then acquired a series of traces, each taken with one channel turned off. The Pol-Mux OSA then performs the Pol-Mux OSNR
calculations via a user-friendly wizard.
The commissioning assistant therefore greatly accelerates OSNR measurements based on the channel shutdown method,
and drastically reduces potential human errors. In addition, two standards-compliant calculation approaches are available in the
commissioning assistant: one compliant with the IEC-61282-12 standard (under revision), and the other compliant with the China
Communications Standards Association (CCSA) method YD/T 2147-2010.
IMPAIRMENT IDENTIFICATION FOR FASTER TROUBLESHOOTING
WDM networks are becoming increasingly complex, with new technologies being
deployed (tighter channel spacing, polarization-multiplexed signals, etc.) that increase
the number of potential causes for failure. While past impairment types were relatively
few and well-known (excessive loss, high dispersion, excessive ASE noise, etc.), these
newly deployed technologies give rise to previously uncommon impairments, such as
crosstalk and nonlinear effects.
This is now possible with EXFO’s WDM Investigator, which provides detailed information
about the signal and noise for each channel. The WDM Investigator provides information
on link characteristics, such as the presence of polarization-multiplexed signals or the
presence of carved noise due to filters or ROADMs. It also checks the presence of
several types of impairments (crosstalk, non-linear effects, carrier leakage and PMD pulse
spreading), and gives an assessment of their severity (OK, warning, risk).
HIGH RESOLUTION FOR DENSE SIGNAL ANALYSIS
With 33 pm (or ~4.5 GHz) resolution bandwidth defined as the FWHM of the OSA filter shape, the IQS-5240BP can analyze
all densely spaced signals, including important 25 GHz ITU-grid WDM signals, and any high-speed modulated lasers/emitters.
Combined with a very sharp rejection ratio (–35 dBc at 0.1 nm), the optical signal-to-noise ratio (OSNR) and modulated band
profile can be measured with high accuracy. To ensure accurate noise and broad signal power measurements, the noise-equivalent
bandwidth (NEB) of the OSA is calibrated at many points from 1250 nm to 1650 nm.
IQS-5240S-P/BP Optical Spectrum Analyzers
ANALYZE ANY WDM NETWORK
The IQS-5240S-P/BP OSA series covers your DWDM applications and all channel
spacings from 12.5 GHz DWDM to CWDM. This is what we call “no-compromise
performance,” whatever your network specificities and testing requirements may be.
FLEXIBLE AND POWERFUL AUTOMATION
Thanks to the IQS-600 platform’s Windows-based open
architecture and Ethernet connectivity, the IQS-5240S-P/BP
OSA test modules can be easily controlled remotely using
SCPI commands.
QUICKER SETUPS–EASIER TESTING
The application software has been designed to optimize all testing operations—boosting productivity.
Easy-to-use zooming
capabilities and quick
translation of the signal
trace.
Favorites button enables direct access
to your defined configuration list—right in
the field.
Discover button automatically adjusts the settings
to identify all channels in one easy step. It
automatically selects optimal settings for quick
system qualification.
Setups and test configurations can easily be
defined and stored in the instrument.
IQS-5240S-P/BP Optical Spectrum Analyzers
ADVANCED EDFA ANALYSIS
Since amplifiers are critical elements in all networks, it is crucial to ensure that they are optimized, that the
gain is well-distributed and that the output power is flat. Now, you can further optimize EDFAs by measuring
key parameters such as gain per channel, noise figure, gain flatness and gain slope. More importantly,
you can save and print this precious information.
DRIFT MEASUREMENTS
You can monitor power, wavelength and OSNR over time. Follow the evolution of these critical parameters,
set relative or absolute thresholds and get alarm notifications when they are crossed. You can also
visualize the current and historical status of all channels in a single interface called drift dashboard,
which enables you to view the WDM trace of any acquisition that displays a change of state (i.e., when
a threshold is crossed).
ACCURATE SPECTRAL TRANSMITTANCE
With the advent of larger spectral content through the implementation of 40G and 100G, knowing
the bandwidth of any given filter and the residual network bandwidth guarantees proper transmission.
The Spectral Transmittance software feature compares the filtered wavelength to the nominal one,
showing insertion loss, channel isolation and bandwidth at different power levels.
IN-DEPTH DFB LASER ANALYSIS
Make sure your transmitters are within specifications. With the DFB Laser Analysis feature, you can
characterize a DFB laser source for central wavelength, peak power, bandwidth, side-mode suppression
ratio (SMSR) and much more.
EXFO Connect
AUTOMATED ASSET MANAGEMENT. GET CONNECTED.
EXFO Connect pushes and stores test equipment automatically in the cloud,
allowing you to streamline test operation from build-out to maintenance.
IQS-5240S-P/BP Optical Spectrum Analyzers
SPECIFICATIONS a
SPECTRAL MEASUREMENT
IQS-5240S and IQS-5240S-P
IQS-5240BP
1250 to 1650
1250 to 1650
±0.05
±0.01 c, d
±0.03
±0.01 c, d
Reference
Internal e
Internal
Resolution bandwidth (FWHM) (nm) f
0.065 b, d
0.033 b, d
Wavelength linearity (nm)
±0.01
b, d
±0.01 b, d
Wavelength repeatability 2σ (nm)
±0.003 g
±0.002 g
IQS-5240S and IQS-5240S-P
IQS-5240BP
–80 h to +18
–80 h to +18
Wavelength range (nm)
Wavelength uncertainty (nm)
b
POWER MEASUREMENT
Dynamic range (dBm) (per channel) b
Maximum total safe power (dBm)
+23
+23
Absolute power uncertainty (dB) i
±0.5
±0.5
Power repeatability 2σ (dB) d, g
±0.05
±0.04
IQS-5240S and IQS-5240S-P
IQS-5240BP
35 (40 typical)
45 (50 typical)
45 (50 typical)
50 (55 typical)
Channel spacing
25 to 200 GHz
CWDM
12.5 to 200 GHz
CWDM
PDL at 1550 nm (dB)
±0.08 d
±0.06 d
ORL (dB)
≥40
≥40
OPTICAL MEASUREMENT
Optical rejection ratio at 1550 nm (dB)
at 0.2 nm (25 GHz)
at 0.4 nm (50 GHz)
IN-BAND OSNR MEASUREMENT d, j
IQS-5240S-P only
IQS-5240BP
OSNR dynamic range (dB)
>35 k
>35 k
OSNR measurement uncertainty (dB)
Repeatability (dB)
Data signals
Measurement time (s)
(includes scanning, analysis and display)
d, o
Analysis modes
±0.5
l
±0.5 l
±0.2
m
±0.2 m
Up to 100 Gbit/s n
Up to 100 Gbit/s n
<6 (eight scans)
<6 (eight scans)
WDM, EDFA, drift, spectral
transmittance, DFB, BP
WDM, EDFA, drift, spectral
transmittance, DFB
POL-MUX OSNR MEASUREMENT
Commissioning assistant q
Modulation formats
Any, including Pol-Mux formats DP-QPSK and DP-BPSK
Data signals
Up to 400 Gbit/s
Measurements time d, p
1 minute and 20 seconds (100 scans) for trace with all channels on.
<5 seconds for traces with a single channel off.
Notes
a. All specifications are for a temperature of 23 °C ± 2 °C with an FC/UPC connector unless
otherwise specified, after warm-up.
b. From 1520 to 1610 nm.
c. After user calibration in the same test session within 10 nm from each calibration point.
d. Typical.
e. Integrated and wavelength-independent self-adjustment.
f. Full width at half maximum.
g. Over one minute in continuous acquisition mode.
h. With averaging.
i.
At 1550 nm, –10 dBm input.
j.
In-band OSNR measurement performed with 64 scans.
k. For an optical noise level of > –60 dBm.
l.
With PMD ≤15 ps and no crosstalk, uncertainty specification is valid for OSNR ≤ 25 dB.
m. Repeatability specification is valid for OSNR ≤ 25 dB.
n. Except for Pol-Mux and fast polarization scrambled signals.
o. 45 nm span, full resolution, 20 peak analysis.
p. 1525 nm to 1570 nm.
q. Data acquisition and analysis available on FTB-500 and FTB-2 Pro. On FTB-200v2,
data acquisition on the platform and data analysis on PC
IQS-5240S-P/BP Optical Spectrum Analyzers
GENERAL SPECIFICATIONS
SELECTION GUIDE
Temperature
operating
storage
0 °C to 40 °C (32 °F to 104 °F)
—20 °C to 50 °C (—4 °F to 120 °F)
OSA Module
Relative humidity
0 % to 95 % noncondensing
Connectors
EI (EXFO UPC Universal Interface)
EA (EXFO APC Universal Interface)
Size (H x W x D)
IQS-5240S module
IQS-5240BP module
125 mm x 112 mm x 282 mm (4 15/16 in x 4 7/16 in x 11 1/8 in)
125 mm x 112 mm x 282 mm (4 15/16 in x 4 7/16 in x 11 1/8 in)
Weight
IQS-5240S module
IQS-5240BP module
1. 5 kg (3.3 lb)
1.7 kg (3.8 lb)
CWDM
DWDM
DWDM
(100 GHz spacing)
(50 GHz spacing)
ROADM +
40 Gbit/s network
IQS-5240S
X
X
X
IQS-5240S-P
X
X
X
X
IQS-5240BP
X
X
X
X
LASER SAFETY
Class 1 laser product in compliance with standards IEC 60825-1: 2007 and 21 CFR 1040.10.
Laser radiation may be encountered at the output port.
ORDERING INFORMATION
IQS-5240S-NS1623-XX-XX-ADV-XX
Polarization controller option
00 = Without polarization controller
P = With polarization controller
Connector adapter *
EI-EUI-28 = UPC/DIN 47256
EI-EUI-76 = UPC/HMS-10/AG
EI-EUI-89 = UPC/FC narrow key
EI-EUI-90 = UPC/ST
EI-EUI-91 = UPC/SC
EI-EUI-95 = UPC/E-2000
EA-EUI-28 = APC/DIN 47256
EA-EUI-89 = APC/FC narrow key
EA-EUI-91 = APC/SC
EA-EUI-95 = APC/E-2000
Example: IQS-5240S-NS1623-P-EI-EUI-89-Adv-InB
Software option
Adv = Enables advanced measurement mode a
InB = Enables the in-band OSNR option b
Inv = Enables the WDM Investigator option b, c
Com = Enables the commissioning assistant
option b
IQS-5240BP-NS1594-XX-ADV-XX
Example: IQS-5240BP-NS1594-EI-EUI-89-Adv-InB
* EXFO Universal Interface is protected by US patent 6,612,750.
Connector adapter *
EI-EUI-28 = UPC/DIN 47256
EI-EUI-76 = UPC/HMS-10/AG
EI-EUI-89 = UPC/FC narrow key
EI-EUI-90 = UPC/ST
EI-EUI-91 = UPC/SC
EI-EUI-95 = UPC/E-2000
EA-EUI-28 = APC/DIN 47256
EA-EUI-89 = APC/FC narrow key
EA-EUI-91 = APC/SC
EA-EUI-95 = APC/E-2000
Software option
Adv = Enables advanced measurement mode a
InB = Enables the in-band OSNR option a
Inv = Enables the WDM Investigator option
Com = Enables the commissioning assistant
option
Notes
a. Always included.
b. Available with IQS-5240S-P only.
c. Requires InB enabled.
EXFO Headquarters
>
Tel.: +1 418 683-0211 | Toll-free: +1 800 663-3936 (USA and Canada) | Fax: +1 418 683-2170 | info@EXFO.com | www.EXFO.com
EXFO serves over 2000 customers in more than 100 countries. To find your local office contact details, please go to www.EXFO.com/contact.
EXFO is certified ISO 9001 and attests to the quality of these products. EXFO has made every effort to ensure that the information contained in this specification sheet is accurate. However, we accept no
responsibility for any errors or omissions, and we reserve the right to modify design, characteristics and products at any time without obligation. Units of measurement in this document conform to SI standards
and practices. In addition, all of EXFO’s manufactured products are compliant with the European Union’s WEEE directive. For more information, please visit www.EXFO.com/recycle. Contact EXFO for prices
and availability or to obtain the phone number of your local EXFO distributor.
For the most recent version of this spec sheet, please go to the EXFO website at www.EXFO.com/specs.
In case of discrepancy, the web version takes precedence over any printed literature.
SPIQS5240SP/BP.4AN
© 2016 EXFO Inc. All rights reserved.
Printed in Canada 16/11

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project