Beam Diagnostics Brochure
Beam Diagnostics
Integrating Sphere
M2 Measurement
System
Touchscreen Power
Meter Console
Handheld
Power Meter
Our Beam Profiler Software
Beam Analysis
Thorlabs offers a wide range of instrumentation for beam characterization and
diagnostics. This booklet provides an overview of our line of power and energy meters,
including a large selection of sensor heads, scanning slit and camera beam profilers,
compact M² analysis systems for automated beam quality measurements, wavefront
sensors, spectrometers, spectrum analyzers, interferometers, and polarimeters.
These devices are designed and manufactured in house by diverse groups of
specialized Thorlabs engineers. We have a long history of bringing key photonics
equipment to the market and frequently update our offerings so they continue to
provide the features and benefits our customers expect.
Beam Diagnostics Tools
Beam Profile
Power &
Energy
Parameter Analysis Tool
Power & Energy
Meters & Consoles
Beam
Quality
Applications
u Touchscreen, Digital, and Analog Displays
u Laser Monitoring
u Single and Dual Channel
u Optical Alignment
u Over 30 Compatible Sensors
u Laser Development
u Wireless and Compact USB Optical Power Meters
u Fiber Inspection
u Energy and Power Measurements
u Microscope Power Inspection
u Signal to Noise Ratio ≥62 dB
u Laser Monitoring
u 2D Analysis of Beam Profile
u Laser Development
u External Shutter Trigger Input
u Beam Alignment
u For CW, Pulsed Signals, and Single Pulse Analysis
u Beam Stability Measurement
CCD Beam Profilers
Scanning Slit Beam Profilers
Wavefront
Features
M2 Beam
Quality Analysis System
Shack-Hartmann Sensors
u Analysis of Asymmetrical Beams
u Two Wavelength Ranges
u Laser Monitoring
u Scanning Speeds from 2 to 20 Hz
u Laser Development
u Beam Diameter from 2.5 µm to 9 mm
u Laser Quality Optimization
u Dynamic Range: 78 dB
u High Spatial Resolution Analysis
u Additional Knife-Edge Mode
u Measures M2, Divergence, Waist Diameter, Waist
u Automated Laser
Position, and Rayleigh Length
Quality Control
u Turnkey Operation and Easy Alignment
u Beam Quality Characte­rization
u Movable Retroreflector
u Compliant with ISO 11146 Beam Measurement Standards
u Exchangeable Microlens Array
u Adaptive Optics
u Real-Time Wavefront and Intensity
u Optical Elements
Distribution Measurements
Characterization
u For CW and Pulsed Light Sources (Trigger Input)
u High-Speed Wavefront Sensing
u Live Data Readout via TCP/IP
u Rugged Czerny-Turner Design without Moving Parts
u General Spectrometry
u Integration Time: 10 µs - 60 s
Compact
CCD Spectrometers
u External Synchronization (TTL Trigger Input)
u Calibrated Response over Wavelength Range
Spectrum
u Fourier Transform OSAs
u Broadband Spectrometer and
Wavemeter Functionality
u Optical Components
Characterization
u Optical Signals Testing
u Spectral Resolution: 7.5 GHz (0.25 cm-1)
Optical Spectrum Analyzers
u Includes Laptop with Pre-Installed Software
u Ultra-Stable Invar Cavity
u High Resolution Spectroscopy
u Confocal Cavity Design
u Molecular Spectroscopy
u Input/Output Alignment Irises
u Laser Line Characterization
u Two Finesse Options: 200 and 150
Polarization
Fabry-Perot Interferometers
u 1.5 GHz or 10 GHz Free Spectral Range
u High Dynamic Range
uPolarimetry
u Based on Rotating Wave Plate
u Extinction Ratio Measurement
u Fiber and Free-Space Polarimetry
u External Interchangeable Sensor Head
Terminating Polarimeters
u Available 2nd Quarter of 2017
for PM Fibers
Item #
PM160
Wavelength Range
400 - 1100 nm
Energy/Power Range
Beam Diameter
10 nW - 200 mW
Ø9.5 mm
PM160T
190 - 10600 nm
100 µW - 2 W
Ø10 mm
PM160T-HP
250 - 16000 nm
10 mW - 70 W
Ø1"
PM16-x
7 Models; See www.thorlabs.com
PM400
Free Space & Fiber
PM200
PM100D
PM100A
Beam Type
Sensor Dependent (See Power & Energy Sensors Section on Following Pages)
PM100USB
PM320E
PM20x
3 Models; See www.thorlabs.com
BC106N-UV
190 - 350 nm
50 fW - 1 W
BC106N-VIS
350 - 1100 nm
1 fW - 1 W
BP209-VIS
200 - 1100 nm
BP209-IR
900 - 1700 nm
M2MS
400 - 2700 nm
M2MS-AL
Fiber
30 µm - 6.6 mm
Free Space
10 nW - 10 W
2.5 µm - 9 mm
Free Space
250 - 600 nm
Depends on User-Supplied
Beam Profiler
Depends on User-Supplied
Beam Profiler
M2MS-BC106VIS
400 - 1100 nm
50 fW - 1 W
M2MS-BC106UV-AL
250 - 350 nm
1 fW - 1 W
M2MS-BP209VIS-AL
250 - 600 nm
M2MS-BP209VIS
400 - 1100 nm
M2MS-BP209IR
900 - 1700 nm
WFSx-5C
300 - 1100 nm
WFSx-7AR
400 - 900 nm
WFSx-14AR
400 - 900 nm
CCS100
350 - 700 nm
CCS175
500 - 1000 nm
CCS200
200 - 1000 nm
OSA201C
350 - 1100 nm
OSA202C
600 - 1700 nm
OSA203C
1000 - 2600 nm
OSA205C
1000 - 5600 nm
OSA207C
1000 - 12000 nm
SA200-3B
350 - 535 nm
SA200-5B
535 - 820 nm
SA200-8B
820 - 1275 nm
SA200-12B
1275 - 2000 nm
SA200-18C
1800 - 2600 nm
SA210-3B
350 - 535 nm
SA210-5B
535 - 820 nm
SA210-8B
820 - 1275 nm
SA210-12B
1275 - 2000 nm
SA210-18C
1800 - 2600 nm
PAX1000VIS
400 - 700 nm
PAX1000IR1
600 - 1080 nm
PAX1000IR2
900 - 1700 nm
30 µm - 6.6 mm
Free Space
10 nW - 10 W,
Depending on
Beam Diameter
20 µm - 9 mm
–
WFS20: 7.20 x 5.40 mm²
WFS30: 11.43 x 7.13 mm²
Free Space
–
N/A
Fiber
Damage Threshold
of Detector:
10 mW
Free-Space Input:
Ø6 mm Max
Free Space & Fiber
≤600 µm
(Max Beam
Waist Diameter)
–
Free Space
≤150 µm
(Max Beam
Waist Diameter)
-60 dBm to
+10 dBm
≤Ø3 mm
Free Space & Fiber
Optical Power & Energy Meters and Consoles
Features
Wireless Optical Power Meters
These wireless power meters
u
have integrated sensors.
Operation
The sensor design has a
u
270° rotatable arm for
Wavelength: 400 nm - 1100 nm (PM160),
190 nm - 10.6 µm (PM160T), or
convenient beam pick-up.
PM160
Bluetooth, USB, and Self-Contained
250 nm - 16 µm (PM160T-HP)
The power meters include
the appropriate spectral response curves (a second spectral response
u
OLED Display with 96 x 64 Pixels
curve is included for the PM160 photodiode power meter when used with
u
Apps for Android™ and iOS®
the included attenuator).
Features
Compact USB Power Meters
Thorlabs has integrated four sensor head
PM16-401
u
Standard Photodiodes: 400 - 1800 nm
u
Slim Photodiode: 400 - 1100 nm
all of which are controlled by our software
u
Integrating Spheres: 350 - 1700 nm
installed on a Windows operating system.
u
Thermal Sensor: 190 nm - 10.6 µm
package types with a compact USB interface.
Seven different models are currently available,
®
Touchscreen Power & Energy Meter Console
Features
The PM400 features advanced spectral correction
u
Color Capacitive Touchscreen
capabilities that allow the user to save and apply
u
Support for Spectral Calibration and
spectral calibration and attenuation correction
Attenuation Correction
files. The capacitive touchscreen enables fast
PM400
access to measurement settings, while the use of
u
Inputs for Temperature and Humidity Sensors
multi-touch technology allows data displays to be
u
USB 2.0 Interface for Remote Control,
zoomed and scrolled with hand gestures.
Data Transfer, and Charging
Touchscreen Power & Energy Meter Console
This power meter console features a
u
Color Resistive Touchscreen
u
Compact, Rubber-Protected Enclosure
our power and energy sensors, and can also
u
90° Flip Screen and Swivel Kick Stand
accept Thorlabs' unamplified photodiodes,
u
Advanced Spectral Correction Support
touchscreen with a high-contrast readout and
a wide viewing angle. It is compatible with all
PM200
thermopiles, and pyroelectric sensors.
Digital Handheld Power & Energy Meter Console
Features
The PM100D is compatible with all of our power
u
and energy sensors, which combined detect
Measurements
powers from 100 pW to 200 W, energies from
Accurate Power and Energy
u
30 Compatible Sensors
25 µm. In addition to our sensors, they accept
u
320 x 240 Pixel Backlit LC Display
Thorlabs' unamplified photodiodes, thermopiles,
u
SD Card Slot for Recording Data
10 µJ to 15 J, and wavelengths from 185 nm to
PM100D
Features
and pyroelectric sensors.
Power Meter Console with Analog Needle & LCD
Features
u
The PM100A combines a large analog
needle for relative power tuning and
Optical Power Measurements and Tuning
u Over
an LCD display for accurate numerical
20 Compatible Sensors
u Analog
readouts and device settings. The display
Needle with 132 x 32 Pixel LCD
also offers different screens for absolute/
relative measurements, power tuning, statistics, etc.
PM100A
Compact Power & Energy Sensor Interface
Features
u Power
The PM100USB is a very compact power and energy
and Energy Measurements
u Compact
Aluminum Housing:
93 mm x 60 mm x 29 mm
u 16-Bit
A/D Converter
meter that provides a USB interface for all of our
power and energy sensors. It offers the same features,
precision, and accuracy as the PM100D via its USB
interface without a direct readout screen, and
includes an SD card slot and analog monitor port.
PM100USB
Dual-Channel Power & Energy Meter Console
Features
PM320E consoles can be connected to
u Programmable
Channels
u Programmable
Responsivity
u Continuous
and Single-Shot Energy
Measurements of Pulsed Laser Sources
two sensors, enabling differential and
ratiometric measurements. There are two
analog high-bandwidth outputs to allow
monitoring of each channel. Customers
can connect their own photodiodes,
thermal elements, or pyroelectric sensors.
PM320E
Handheld Fiber Optic Power Meters
Features
u Interchangeable
LC, SC, SMA, or ST Fiber
Adapters Available (FC Fiber Adapter Included)
u 50
hr Battery Operating Time
u Absolute
and Relative Power Measurements
These fiber optic power meters are full-featured,
handheld instruments, ideal for use in the field.
Three models are available, covering wavelength
ranges from 400 nm to 1700 nm, as well as power
ranges from 1 nW to 200 mW.
PM20A
Overview of Power & Energy Sensor Heads
Detector
Sensor Family
Features
Applications
u Integrated Fluorescing UV or VIS/IR
u General Purpose Power
Viewing Target for Sensor Alignment
Measurements
u Large Sensor Area: Ø9.5 mm
Photodiode Power Sensors
Standard Sensors
u Overtemp Alert Sensor
u Very Slim Design: 5 mm Thickness on
u Power Measurements in
Sensor Side
Tight Spaces
u Slideable ND Filter
Slim Sensors
Integrating
Sphere Sensors
u Optional Fiber Adapters
u FC/PC Fiber Adapter Included
u Power Measurements for
u Fiber Adapters for Bare Fiber and Standard
High Powers and Divergent
Beams
Connectors (Optional)
u Overtemp Alert Sensor
u Compact Sensor Integrated into the
Connector
u Fiber Power Measurements
u Field Applications
u FC and SMA Fiber Adapters Included
u Compatible with All PM20x Series Fiber
Fiber Sensors
Adapters (FC, LC, SC, SMA, ST)
u Designed to Measure Light on the Objective
u Power Measurements at
Plane of a Microscope
Samples in Microscopes
u Large Active Area: 18 mm x 18 mm
Microscope Sensors
u Design Prevents Internal Reflections
u Large Sensor Area: Ø10 to Ø25 mm
u Quick Response Time
u Broadband Coatings
Thermopile Power Sensors
u Flat Response over Wavelength
u General Broadband Optical
Power Measurements
u S305C for Use in Tight
Spaces
Broadband Sensors
High-Sensitivity
Thermal Sensor
u Low Drift Measurements to 10 μW
u High-Sensitivity Broadband
u Flat Response Over Full Wavelength Range
Optical Power Measurements
(in Tight Spaces)
u Light Shield & SM1 Adapter Included
u High Damage Threshold
u Large Sensor Area
Sensors for
YAG and Excimer
u Quick Response Time
u Applications with High
Peak Powers
u For YAG and Excimer Lasers
u For Free-Space Applications Only
u Designed to Measure Light on the Objective
u Power Measurements at
Plane of a Microscope
Samples in Microscopes
u Large Active Area: 18 mm x 18 mm
Pyroelectric Energy
Sensors
Microscope Sensors
u Excellent for Broadband Power Measurements
u Black Broadband Coating with Flat Response
u Large Sensor Area
Standard
Energy Sensors
High Energy
Sensors
u General Purpose Energy
Measurements
u BNC Connector for Use with Oscilloscopes
u Ceramic Coating with High Damage Threshold
u Energy Measurements of
u Large Sensor Area
High-Energy-Density Lasers:
Excimer, CO2-TEA, Nd:YAG
u BNC Connector for Use with Oscilloscopes
Item #
Wavelength
Energy/Power Range
S120VC
200 - 1100 nm
50 nW - 50 mW
S120C
400 - 1100 nm
50 nW - 50 mW
S121C
400 - 1100 nm
500 nW - 500 mW
S122C
700 - 1800 nm
50 nW - 40 mW
S130VC
200 - 1100 nm
Dual Range:
500 pW - 0.5 mW (or up to 50 mW)
S130C
400 - 1100 nm
Dual Range:
500 pW - 5 mW (or up to 500 mW)
S132C
700 - 1800 nm
Dual Range:
5 nW - 5 mW (or up to 500 mW)
S140C
350 - 1100 nm
1 µW - 500 mW
S142C
350 - 1100 nm
1 µW - 5 W
S144C
800 - 1700 nm
1 µW - 500 mW
S145C
800 - 1700 nm
1 µW - 3 W
S146C
900 - 1650 nm
10 µW - 20 W
S148C
1200 - 2500 nm
1 µW - 1 W
Detector Type
Si
Ge
Aperture
Resolution Linearity
Ø9.5 mm
1 nW
Ø9.5 mm
1 nW
Ø9.5 mm
10 nW
Ø9.5 mm
2 nW
PM16-122
Ø9.5 mm
100 pW
-
Ø9.5 mm
100 pW
Ge; Slim
Ø9.5 mm
1 nW
Si;
Integrating
Ø12 mm
Ø5 mm
InGaAs;
Integrating
Ø12 mm
10 nW
-
Ø5 mm
10 pW
-
Ø5 mm
100 pW
Ø5 mm
10 pW
Ø5 mm
100 pW
100 pW - 3 mW
S155C
800 - 1700 nm
1 nW - 20 mW
S170C
350 - 1100 nm
10 nW - 150 mW
Si
18 x 18 mm
1 nW
S302C
190 - 25000 nm
100 µW - 2 W
Stabilized Thermal
Absorber
Ø12 mm
1 µW
S310C
190 - 25000 nm
10 mW - 10 W
Ø20 mm
200 µW
10 µW - 1 W (3 Wd)
S350C
190 - 1100 nm
& 10600 nm
10 mW - 40 W
S370C
400 - 5200 nm
10 mW - 10 W
S470C
250 - 10600 nm
100 µW - 5 W
S175C
300 - 10600 nm
100 µW - 2 W
ES111C
185 - 25000 nm
10 µJ - 150 mJ
ES120C
185 - 25000 nm
100 µJ - 500 mJ
ES145C
185 - 25000 nm
500 µJ - 2 J
ES220C
185 - 25000 nm
500 µJ - 3 J
ES245C
185 - 25000 nm
1 mJ - 15 J
Si;
Fiber-Coupled
InGaAs;
Fiber-Coupled
Ø25 mm
1 mW
Ø25 mm
5 mW
Ø10 mm
100 µW
Stabilized Thermal
Volume Absorber
Ø10 mm
1 µW
Thermal
Surface Absorber
Ø40 mm
1 mW
Ø25 mm
250 µW
Ø15 mm
10 µW
18 x 18 mm
10 µW
Ø11 mm
100 nJ
Thermal
Volume
Absorber
Thermal Volume
Absorber
Pyroelectric
Broadband
Coating
Pyroelectric
Ceramic
Coating
-
Ø7 mm
800 - 1700 nm
190 - 10600 nm
<1 µsb
-
S154C
S401C
PM16-144
1 nW
1 nW - 20 mW
10 mW - 5 W
-
Ø5 mm
400 - 1100 nm
190 - 25000 nm
PM16-130
-
S151C
S305C
<1 µsb
10 nW
100 pW - 5 mW
100 mW - 200 W
PM16-121
-
±0.5%
350 - 1100 nm
250 - 11000 nm
PM16-120
Ø12 mm
MCT (HgCdTe)
Integrating
Thermal Surface
Absorber
±0.5%
1 nW
S150C
S322C
<1 µsb
PM16-140
1 µW - 3 W
10 mW - 40 W
±0.5%
Ø5 mm
2900 - 5500 nm
250 - 11000 nm
-
Si; Slim
S180C
S314C
Response Available in Compact USB
Power Meter Formata
Time
Ø20 mm
Ø45 mm
1 µJ
Ø20 mm
25 µJ
Ø45 mm
50 µJ
-
±0.5%
<1 µsb
±0.5%
<1 µs
-
3 sc
-
-
b
±1%
<1 sc
-
±0.5%
<1 sc
PM16-401
1 sc
-
3 sc
-
±0.5%
<2 sc
-
±0.5%
<2 sc
-
±1%
±1%
N/Ae
-
±1%
N/Ae
-
a. Select sensors are offered from stock in our Compact USB Power Meters. To order other sensor heads in this format, please contact [email protected]
b. Of the Photodiode Sensor. Actual response time will be limited by the update rate of the console.
c. Response time is limited by the sensor material. Thorlabs' thermal sensor and power meter consoles are designed so that the incident power can be determined after a
single sensor time constant, which results in a lower response time than other comparable thermal sensors.
d. With Intermittent Use (Maximum Exposure Time of 20 Minutes)
e. All pyroelectric sensors have a 20 ms thermal time constant, τ. This value indicates how long it takes the sensor to recover from a single pulse. To detect the correct
energy levels, pulses must be shorter than 0.1τ and the repetition rate of your source must be well below 1/τ.
CCD Camera Beam Profilers
Features
u
High Resolution: 1360 x 1024 Pixels
u
Auto-Exposure from 20 µs to 1 s
dB Signal to Noise Ratio
u
Gain Control from 1X to 16X
Windowless Sensor Area for Best
u
Six Filters on Filter Wheel
u
Black Level and Ambient Light
u ≥62
u
Uniformity and Linearity
u
Full 2D Analysis of Complex
Beam Profiles
u
Compensation
u
Power Readout: 50 fW - 1 W (BC106N-UV)
or 1 fW - 1 W (BC106N-VIS)
BC106N-UV
For CW or Pulsed Laser Beams and
Single Pulse Analysis
u
External Shutter Trigger Input
Camera-based CCD Beam Profilers show more details than scanning slit profilers and offer true 2D analysis of the beam’s power
density distribution. This allows complex mode patterns (like flat top and donut) to be identified while optimizing the laser systems.
These beam profilers can also be used to measure relative optical power and are suited for simultaneous power and beam
shape optimization. They can be used to measure continuous wave (CW) and pulsed beams of any frequency.
Several trigger modes allow flexible capturing
of single beam pulses. A TTL input is provided for
triggered single-pulse detection up to a repetition
rate of 50 kHz. See the Beam Profiler Software
Package section later in this brochure for more
Specifications
Item #
Wavelength Range
Power Range
information on the software and driver package.
Attenuation Filtersd
The redesigned BC106N series offers improvements
Beam Diameter
in mechanical precision and robustness. An
Pulse Frequency
ND filters allows the profiler to be easily adapted
Sensor
to beam intensities from femtowatts to 1 W without
Coating
on each filter mount provides compatibility with our
Chip Type
lens tube systems. Also see the M2 Beam Quality
Aperture Size (Max)
Analysis System page for the use of the BC106N
Pixel Size
with our M Measurement System Extension Set.
Resolution (Max)
2
BC106N-VIS
190 - 350 nm
350 - 1100 nm
50 fW - 1 W
1 fW - 1 Wc
20, 30, 40 dB (VIS)
20, 30, 40 dB (UV)
20, 40, 60 dB (350 - 700 nm)
20, 40, 60 dB (650 - 1050 nm)
a
b
30 µm - 6.6 mm
Compatible Light Sources
integrated filter wheel with six different high-quality
extra accessories. The SM05 (0.535"-40) threading
BC106N-UV
CW, Pulsed
1 Hz - 50 kHz (Single Pulse Exposure)
Unlimited (Multi-Pulse Exposure)
Lumigen
None
2/3" EXview HAD CCD Sensor
Sony ICX285AL, Window Removed
TM
8.77 mm x 6.6 mm
6.45 µm Square
1360 x 1024 Pixels, ROI Selectable
Camera
Power (W)
BC106N Operating Range
104
> 1 W for Short Time Only
102
100
10-2
10-4
10-6
10-8
10-10
10-12
10-14
10-16
10
100
1000
Beam Diameter (µm)
BC106N-UV:
BC106N-VIS:
at 200 nm
at 550 nm
Shutter
10 fps Full Resolution,e >43 fps Reduced ROIf
Image Digitization
8 Bit (0 - 255 Digits) or 12 Bit (0 - 4095 Digits)
Signal-to-Noise Ratio
Exposure Range
Gain Range
Image Capture Modes
10000
at 200 nm with 40 dB Neutral Density Filter
at 550 nm with 60 dB Neutral Density Filter
Global
Frame Rate
≥62 dB
20 µs - 1 s
1X - 16X
Single Frame, Continuous, Hardware Triggered
a. Wavelength range of supplied removable UV ND filters starts at 220 nm.
b. @ 200 nm, depending on beam diameter and ND filter.
c. @ 550 nm, depending on beam diameter and ND filter.
d. Nominal values on filter wheel.
e. Highly dependent on PC processor and graphic adapter performance.
f. Region of Interest: 320 x 240 Pixel
Scanning Slit Beam Profilers
Features
u
High-Precision Analysis of Beam
Quality and Spatial Power Distribution
u Standalone
u
Measurement Head
Dynamic Range of 78 dB
u
For CW and Pulsed Sources
with a Repetition Rate ≥10 Hz
Two Wavelength Ranges:
200 - 1100 nm and 900 - 1700 nm
u
u
u
Additional Knife-Edge Mode
u
Low-Noise Amplifier
Beam Diameter from 2.5 µm to 9 mm
Thorlabs’ Dual Scanning Slit Beam Profilers are ideal for analyzing laser beam
profiles that have a close-to-Gaussian beam shape. For non-Gaussian beam
BP209-VIS
shapes, we recommend our camera beam profilers. These scanning slit profilers
allow fast, simultaneous measurements of both the X and Y profiles with a high
dynamic range of 78 dB and a variable scanning speed from 2 to 20 Hz without the need for attenuators in the beam path.
There are two models available: one for use with light in the 200 - 1100 nm range and a second for use with light in the
900 - 1700 nm range.
This design offers two slit widths, low-noise electronics, and the
additional knife-edge mode, making it possible to analyze an
extended range of beam diameters (2.5 µm to 9 mm) with a
number of industry-standard clip levels, such as 1/e2 (13.5%), 50%,
or an arbitrary clip level set by the user. The brushless rotation
motor incorporated into these profilers extends the lifetime and
makes them ideal for quality control in production environments.
A variable scan rate of up to 20 Hz allows for real-time optical
system alignment. Both beam parameters and spatial power
Power (W)
single device. The beam diameter can be displayed using a
BP209 Operating Range
100
10
1
0.1
0.01
10-3
10-4
10-5
10-6
10-7
10-8
10-9
>1 W for Short Time Only
BP209-IR
BP209-VIS
1
distribution can be monitored in dynamically changing systems.
10
100
1000
Beam Diameter (µm)
10000
Specifications
Item #
BP209-VIS
Wavelength Range
BP209-VIS/M
BP209-IR
200 - 1100 nm
Detector Type
900 - 1700 nm
Si; UV Enhanced
Aperture Diameter
InGaAs
9 mm
Scan Method
Scanning Slits
Slit Size
5 µm and 25 µm
Beam Diameter
2.5 µm (Min) / 9 mm (Max)a
Scan Rate
2 - 20 Hz (Continuously Variable)
Sampling Resolution
0.12 - 1.24 µm (Depending on Scan Rate)
Power Range
10 nW - 10 W (Depending on Beam Diameter and Model)
Amplifier Bandwidth
16 to 1000 kHz in 11 Steps (@ -1 dB)
Sample Frequency
0.2872 - 2.0 MHz
Dynamic Range
Mounting Taps
BP209-IR/M
78 dB (Amplifier Switchable)
1/4"-20 and 4-40
a. Beam Diameter Error <10% for 9 mm Diameter
M6 x 1.0 and M4 x 0.7
1/4"-20 and 4-40
M6 x 1.0 and M4 x 0.7
Beam Profiler Software Package
Features
u
u
Cross-Sectional X and Y Profiles
at Adjustable Locations/Rotation
with Gaussian Fit
Averaging Capabilities
u
M² and Divergence
Measurement
u
u
2D Power Density Diagram with
Elliptical Beam Fit, 3D Graph
u
Position and Power Measurements
as a Function of Time
u
u
u
u
Graphical Beam Overlapping
Pass/Fail Test
Linear, Logarithmic,
Quadratic, and Color Scaling
High-Speed USB 2.0 Interface
Beam Stability Plot
Our versatile beam profiler software and driver package ships
with our CCD Camera, Scanning Slit Beam Profilers, and our M2
(PC Not Included)
Beam Quality Analysis Systems. Its graphical user interface (GUI) allows
individual views of the X and Y beam cross sections, 2D projections, and 3D profiles in gray scale or color mode as well as the
numerical parameters in separate windows. Many details like peak and centroid position, Gaussian approximations of the X
and Y profiles, and elliptical fits of the beam’s cross section can be
superimposed, faded out, or displayed in many different variations.
The beam diameter is calculated according to the ISO 11146
standard (i.e., 4σ) or at any user-defined clip level.
Figure 1: Software GUI
The GUI consists of a toolbar and specific windows for the different
analysis options. These windows can be individually arranged, resized,
closed, and opened to easily adjust to specific tasks.
Figure 2: Beam Fit by Elliptical Approximation
An ideal ellipse is fitted to the measured asymmetric beam profile.
The maximum, minimum, and mean beam diameters as well as the
ellipticity and major axis angle for the ellipse can be calculated from
Figure 1
the fit.
Figure 3: Analyzing Beam Fragments (Camera Beam Profilers Only)
Within a preselected Region of Interest, a rectangular or an elliptical
calculation area can be marked for fragment analysis, enabling the
determination of the fragment’s position, beam diameter, and power
distribution.
Figure 2
Figure 3
Figure 4: Position
The centroid position drift in X and Y is shown to visualize beam
pointing instabilities of a laser source.
Figure 5: Beam Overlapping
The beam overlapping tool is useful for adjusting the location of a
light beam with a second source. Three modes are available: “Plus”,
“Lighten”, and “Difference”.
Figure 4
Figure 5
M2 Beam Quality Analysis System
Features
u
Compact M2 Beam Quality Analysis System:
300 mm x 175 mm x 126 mm
u Measured
Parameters: M2, Divergence, Focus
Diameter, Waist Position, Rayleigh Length
u Movable
Retroreflector Enables Compact
Design with 200 mm Effective Translation
u Applicable
Light Sources: CW and Quasi-CW
Pulsed Laser Sources with Repetition Rate >300 kHz
u Easy
Alignment
u Compliant
M2MS-BP209VIS/M
Complete M2 Beam
Quality Analysis System
(BP209-VIS/M Mounted on
an M2MS Extension Set)
with ISO 11146 Beam
Measurement Standard
When one of our CCD Camera Beam Profilers or
Scanning Slit Beam Profilers is combined with an M2
Measurement Extension Set, the resulting system
Inside View
allows automated, motorized, computer-controlled
M2 analysis. The Measurement Extension Sets are
available with or without a compatible beam profiler.
The beam profiler and focusing lens are in a fixed
position. Movable retroreflectors located on our
DDSM100/M translation stage allow an effective
translation range up to 200 mm, at a velocity up to
500 mm/s. This rugged, easy-to-use design enables
reliable and fast operation. The system integrates
a USB 2.0 hub with ports for the beam profiler, one
other device, and a USB connection to a PC. Our
beam profiler software package (see previous page)
enables accurate measurements of a variety of
beam-related parameters.
We offer the M2 Measurement Set for two
wavelength ranges: 250 nm to 600 nm (M2MS-AL)
and 400 nm to 2700 nm (M2MS). Both sets are
compatible with our BC106 CCD Camera Beam
Profilers and our BP209 and BP10x Scanning Slit
Beam Profilers. The sets are available as a complete
M2 Beam Quality Analysis System (including beam
profiler) or as extension set without profiler.
Included Alignment Laser Mounted on an M2MS Extension Set
Specifications
Item #
Wavelength Range
Translation Stage
Velocity
M2MS-AL
M2MS
250 nm - 600 nm
400 nm - 2700 nma
DDSM100/M
500 mm/s (Maximum)
Effective Translation Range
200 mmb
Lens Focal Length
250 mm
Applicable Light Sources
CW, Pulseda
Typical Measurement Time
15 - 30 s (Depending on Beam Shape)
Beam Profiler Compatibility
BC106 Series, BP209 Series, BP10x Series
a. Depends on Beam Profiler Type
b. -100 mm to +100 mm from Focal Point
Shack-Hartmann Wavefront Sensors
Features
u
Sensitivities up to λ/200 (RMS)
u Speeds
up to 1120 fps
u Factory-Installed
or User-Interchangeable Microlens Arrays
u Real-Time Wavefront and Intensity Distribution Measurements
WFS20-14AR
WFS30-5C
Thorlabs' Shack-Hartmann Wavefront Sensors (SH-WFS)
u Nearly
u For
Diffraction-Limited Spot Size
CW and Pulsed Light Sources (Trigger Input)
provide accurate measurements of the wavefront shape
and intensity distribution of beams. The WFS30 Series
the analyzed wavefront spot field is defined by the pitch of the
incorporates a CMOS camera providing
selected lenslet array (i.e., by the number of active lenslets).
2.3 Megapixel resolution, while the WFS20 Series
The high resolution provided by the CMOS camera sensor in
incorporates a fast CMOS camera capable of reaching
the WFS30 Series allows one to make wavefront measurements
frame rates up to 1120 Hz, depending on the operation
of the spot field with high accuracy and sensitivity. In contrast,
mode and resolution settings. Wavefront sensors are
the high frame rate of the WFS20 Series enables more
available with your choice of three lens arrays or as a kit
wavefront measurements per second and thus can detect
that includes two interchangeable microlens arrays. The
faster wavefront fluctuations. The WFS30 Series are ideal for
latter allows the sensors to adapt to different applications.
accurate analysis of wavefront distortions of light sources and
The lenslet array creates a spot field from the incident
optical components. The WFS20 is designed as a sensor for
wavefront on the camera sensor, which is analyzed
adaptive optics.
based on the location and intensity of the individual
spots. SH wavefront sensors can dynamically measure the
Wavefront Sensors
wavefronts of laser sources, characterize the wavefront
Item #
WFS30 Series
WFS20 Series
distortion caused by optical components or optical
Camera Sensor Type
CMOS
CMOS
systems, and provide real-time feedback for the control of
Aperture Size (Max)
11.34 mm x 7.13 mm
7.20 mm x 5.40 mm
adaptive optics.
Camera Resolution
1936 x 1216 (Max)a
1440 x 1080 (Max)a
Pixel Size
The performance of these wavefront sensors is
determined by the camera features and by the features
of the included microlens array. The spatial resolution of
5.83 µm x 5.83 µm
5.0 µm x 5.0 µm
Frame Rate
64 Hz (Max)
69 - 1120 Hz
Wavefront
Accuracyb
λ/25 RMS (MLA150-5C)
λ/40 RMS (MLA150-7AR)
λ/60 RMS (MLA300-14AR)
λ/30 RMS (MLA150)
λ/60 RMS (MLA300)
Wavefront
Sensitivityc
λ/80 RMS (MLA150-5C)
λ/120 RMS (MLA150-7AR)
λ/200 RMS (MLA300-14AR)
λ/100 RMS (MLA150)
λ/200 RMS (MLA300)
Item #
WFS30-5C/
WFS20-5C
WFS30-7AR/
WFS20-7AR
WFS30-14AR/
WFS20-14AR
Microlens Array
MLA150M-5C
MLA150M-7AR
MLA300M-14AR
Wavelength Range
300 - 1100 nm
400 - 900 nm
Chrome
Mask
AR Coated
Displaced Dot
Microlens Array
Distorted Wavefront
Microlens Array
Coating
Sensor
Missing Dot
The Shack-Hartmann sensor consists of a lenslet array and a
camera. When a wavefront enters the lenslet array, a spotfield is
created on the camera; each spot is then analyzed for intensity
and location. Using this method, Shack-Hartmann wavefront
sensors can dynamically measure the wavefronts of laser sources
or characterize the wavefront distortion caused by optical
components. In addition, they can provide real-time feedback for
adaptive optics systems, such as Thorlabs’ Adaptive Optics Kits.
Lenslet Pitch
Effective Focal
Length (Typical)
150 µm
4.1 mm
300 µm
5.2 mm
14.6 mm
a.Software Selectable
b.Absolute accuracy using internal reference. Measured for spherical wavefronts of
known radius of curvature at 633 nm.
c.Typical relative accuracy. Achievable after and with respect to a user calibration
of 10 image averages. Measured at 633 nm.
How to Choose a Microlens Array/WFS Model
Each Shack-Hartmann Wavefront Sensor is available with three different microlens arrays (MLAs). The WFS30-5C and
WFS20–5C include a chrome-masked MLA, which prevents light from passing between the microlenses. This leads to a higher
contrast in the spot field but will considerably increase the amount of back reflection from the MLA surface. However, it can
be used over a broad wavelength range from 300 to 1100 nm.
The MLAs used with the WFS30-7AR, WFS20-7AR, WFS30-14AR, and WFS20-14AR wavefront sensors are AR coated for the
400 - 900 nm range, making them ideal for applications that are sensitive to back reflections. The versions with a 150 µm
pitch offer a higher number of spots and thus a higher spatial resolution for the wavefront. Wavefront sensors with these
MLAs offer a wider wavefront dynamic range because of their narrower focal length. In contrast to that, sensors that include
the 300 µm pitch MLA achieve considerably higher wavefront accuracy and sensitivity at the expense of lower dynamic
range and spatial resolution.
Two Shack-Hartmann wavefront sensor screen captures are shown: the spot field (left) and the calculated wavefront based on that spot
field information (right).
In our WFS kits, the lens arrays are
fixed by a precision patented
magnetic mount (patented)
and can be easily interchanged
by hand in a few seconds with
the pickup tool that is included
if you order a kit with two
microlens arrays.
Information provided by the Shack-Hartmann wavefront sensor includes
total power at each lenslet (left) and the calculated wavefront
distribution (right).
Wavefront Sensor Kits
Item #
WFS30-K1
WFS30-K2
WFS20-K1
WFS20-K2
Sensor Series
WFS30 (CMOS Sensor)
WFS20 (CMOS Sensor)
Lens Array 1
Lens Array 2
Chrome Mask, 300 - 1100 nm, Pitch = 150 µm
AR Coated, 400 - 900 nm, Pitch = 300 µm
AR Coated, 400 - 900 nm, Pitch = 150 µm
AR Coated, 400 - 900 nm, Pitch = 300 µm
Chrome Mask, 300 - 1100 nm, Pitch = 150 µm
AR Coated, 400 - 900 nm, Pitch = 300 µm
AR Coated, 400 - 900 nm, Pitch = 150 µm
AR Coated, 400 - 900 nm, Pitch = 300 µm
Compact USB Spectrometers
Features
CCS200
u
Rugged Czerny-Turner Design with No Moving Parts
u
Minimum Integration Time of 10 µs
u
Auto Compensation for Dark Current Noise
u
Trigger Input for External Synchronization (TTL)
u
16-Bit A/D Converter
u
Cosine Correctors Available for Free-Space Input
Thorlabs’ three fiber-based, compact, Czerny-Turner
designed to mate with either an SMA905-terminated fiber
spectrometers provide detection in the 350 - 700 nm or
or the input port of a CCS spectrometer. They allow the CCS
500 - 1000 nm range with sub-nanometer resolution, or
spectrometers to be used for free-space measurements. The
over the 200 - 1000 nm range with <2 nm resolution. With
spectrometer comes with a software package that has a
a footprint that measures roughly the size of a portable
GUI and an extensive set of drivers (see the Optical Analyzer
hard drive, these spectrometers are ideal for educational
Software section later in the brochure).
applications and fiber-based systems.
Although small, the unit shares features with larger, more
expensive spectrometers, such as the ability to compensate
for noise created by dark current and to be synchronized via
a TTL trigger input up to 100 Hz. The three models share the
same design with the CCD chips, gratings, and lenses being
optimized for the specified wavelength range.
Each spectrometer is factory calibrated and ships with
a calibration report, manual, software CD-ROM, SMB-toBNC adapter cable for external trigger input, high-speed
USB cable (1.5 m), and a fiber optic patch cable (SMA905
connectors, 1 m). Recalibration can be easily done by the
user at any point. Separately available cosine correctors are
Color Analysis Screen
Specifications
Item #
CCS100(/M)
CCS175(/M)
CCS200(/M)
Wavelength Range
350 - 700 nm
500 - 1000 nm
200 - 1000 nm
Spectral Resolution
<0.5 nm FWHM @ 435 nm
<0.6 nm FWHM @ 633 nm
<2.0 nm FWHM @ 633 nm
Slit (W x H)
Grating
20 µm x 2 mm
1200 Lines/mm, 500 nm Blaze
Detector Range
830 Lines/mm, 800 nm Blaze
350 - 1100 nm
200 - 1100 nm
CCD Pixel Size
8 µm x 200 µm (8 µm Pitch)
CCD Sensitivity
160 V / (lx • s)
Resolution
Scan Rate with Internal Trigger
10 px/nm
600 Lines/mm, 800 nm Blaze
6 px/nm
4 px/nm
200 Scans / s (Max)
a
a. Scan rates up to 200 Hz (for 5 ms integration time) are possible with the internal (free running) trigger only. In external trigger mode, the maximum scan rate,
with the same integration time, is 100 Hz.
Optical Spectrum Analyzers
Features
u
Five Wavelength Ranges:
–350 nm to 1100 nm –1.0 to 5.6 µm
–600 nm to 1700 nm –1.0 to 12.0 µm
–1.0 to 2.6 µm
u Michelson
u Spectral
Interferometer-Based OSA
Resolution: 7.5 GHz (0.25 cm-1)
u Wavelength
Meter Mode with 0.1 ppm Resolution
OSA205C
for Sources with <10 GHz Linewidth
u Includes
Laptop with Pre-Installed Software
(See Following Page)
Free-Space
Optical
Input (Left);
Fiber Input
(Right)
Thorlabs’ Optical Spectrum Analyzers are general-purpose
instruments that measure optical power as a function of
wavelength. These instruments are versatile enough to
analyze broadband optical signals, the Fabry-Perot modes
Design
of a gain chip, or a long-coherence-length, single mode
Thorlabs’ FT-OSA utilizes two retroreflectors. These are mounted
external cavity laser. Commonly available OSAs typically
on a voice-coil-driven platform, which dynamically changes
use grating-based monochromators. Thorlabs’ OSAs are
the optical path length of the two arms of the interferometer
Fourier Transform Optical Spectrum Analyzers (FT-OSAs) that
simultaneously and in opposite directions. The advantage of
utilize a scanning Michelson Interferometer in a push/pull
this layout is that it changes the optical path difference (OPD)
configuration as shown in the figure below.
of the interferometer by four times the mechanical movement
of the platform. The longer the change in OPD, the finer the
This approach allows for the design of a full-featured OSA
spectral detail the FT-OSA can resolve.
with the additional benefit of a high-precision wavelength
A beamsplitter divides the optical signal into two separate
meter. Thorlabs' OSAs accept FC/PC-terminated optical
paths. The path length difference between the two paths
fibers. Single mode and step-index multimode fibers with
cores up to Ø50 µm can be used. In addition, the OSAs can
directly accept a collimated free-space input up to Ø6 mm.
is varied from 0 to ±40 mm. The collimated light fields then
optically interfere as they recombine at the beamsplitter.
Specifications
Item #
Wavelength
Range
OSA201C
OSA202C
OSA203C
OSA207C
350 - 1100 nm 600 - 1700 nm 1.0 - 2.6 µm 1.0 - 5.6 µm 1.0 - 12.0 µm
Spectral Resolution
7.5 GHz (0.25 cm-1)
Spectral Accuracy
±2 ppm
Wavelength
Meter Resolutiona
0.1 ppm
Optical Rejection
Ratio
30 dB
Dimensions
OSA205C
320 mm x 149 mm x 475 mm (12.6" x 5.9" x 18.7")
a. For Sources with <10 GHz Linewidth
Reference
HeNe
Unknown
Input
Mirrors
Detector
Assembly
Beamsplitter
Retro-Reflectors
Mirror
Mirror
Moving Carriage
The principle behind Thorlabs’ Spectrum
Analyzer design.
Optical Spectrum Analyzer Software
Our compact CCD Spectrometers and our OSAs use the
same software package. It has a customizable graphical
user interface for acquiring, inspecting, manipulating, and
Features
u
Measurements: Gaussian Transformation,
Absorbance, Transmittance & Relative Difference
analyzing spectra and interferograms. This makes it easy
to locate and track spectral peaks or valleys, measure the
u Available
optical input power over any wavelength range, calculate
u
User Wavelength Calibration
u
Saving and Retrieval of Scans (JCAMP-DX or CSV)
u
User-Defined Position for Markers
an absorption spectrum in real time, or track a large
number of parameters over time. A device interface library,
containing a multitude of routines for data acquisition,
Filters: Peak Finder, Smoothing, Averaging
instrument control, and spectral processing and manipulation,
is also provided. The library can be used to develop
customized software for the user's own application using
Adjustable Parameters
Integration Time
LabVIEW, C, C++, C#, or other programming languages. A
u
"virtual device" mode for evaluating the software is available
u Trigger
at www.thorlabs.com.
Modes: Internal, External, Continuous, Single Shot
u Averaging
Method: Gliding or Block Average
u Smoothing
Method: Block Smoothing
Peak Track analysis mode, which allows the position, amplitude,
and width of peaks in the spectrum to be tracked over time.
The peak and total optical power of a 1550 nm gain chip operating
well below threshold.
The Split View adds an overview that marks the actual zoom
window within the entire operating wavelength range.
The ASE spectrum of the same 1550 nm gain chip shown in the figure
above. The ripple is caused by Fabry-Perot modes in the chip.
Fabry-Perot Interferometers
Features
u Ultra-Stable
Invar Cavity
u Confocal
Cavity Design
u Mounted
Input and Output Alignment Irises
u Ten
SA200 Series
1.5 GHz FSR
Models and Five Broad Spectral Ranges
The SA200 family consists of ten Fabry-Perot interferometers
that cover five spectral regions with either a 1.5 GHz or
10 GHz Free Spectral Range (FSR). The interferometer cavity
is comprised of an Invar cavity with internal piezo stacks. This
design utilizes the negative thermal coefficient of the piezo
stacks to create the nearly athermal cavity that is necessary
SA210 Series
10 GHz FSR
for the stability of these high-resolution spectrometers.
To achieve the specified resolution, please note that the
input beam’s waist diameter must not exceed the values
stated in the table below, even though the input aperture
for the instrument is significantly larger. The table below
lists recommended kinematic mounts for each series of
interferometers. The table also lists wavelength range
options; if the options below are not suitable for your
application, please contact [email protected] to
discuss custom options.
The SA201 controller generates a high-stability, low-noise
voltage ramp. This ramp signal is used to scan the separation
SA201
Fabry-Perot
Interferometer
Controller
between the two cavity mirrors. The controller adjusts the
ramp voltage and scan time, allowing the user to choose the
scan range and speed, while an offset control can shift the
spectrum displayed on an oscilloscope to the right or left.
Specifications
Item #
Wavelength
Range
Free Spectral
Rangea
Finesseb
Maximum Beam
Waist Diameterc
Cavity Length
Recommended
Mount Item #
SA200-3B
SA200-5B
350 535 nm
535 820 nm
SA200-8B SA200-12B SA200-18C SA210-3B
820 1275 nm
1275 2000 nm
1800 2600 nm
350 535 nm
SA210-5B
535 820 nm
SA210-8B SA210-12B SA210-18C
820 1275 nm
1275 2000 nm
1.5 GHz
10 GHz
>200 (Minimum)
250 (Typical)
>150 (Minimum)
180 (Typical)
≤600 µm
≤150 µm
50 mm
7.5 mm
KS2 or KC2
KS1 or KC1
a. Free spectral range for a confocal cavity, which is defined by FSR = c/L, where c is the speed of light and L is the cavity length.
b. Effective finesse defined by F1 = FSRΔ, where FSR = c/L and Δ = FWHM impulse response.
c. Moximum beam diameter along the length of the cavity to obtain the typical measured finesse.
1800 2600 nm
PAX1000 Series Free-Space Polarimeters
Available
Q2 2017
Features
u Free-Space
u Fiber
Collimation Adapter Included
u Easy-to-Use
u Up
PAX1000IR1
Polarimeter,
600 - 1080 nm
Input: Ø3 mm, <2° Beam Divergence
USB Interface
to 2048 Points per Fourier Transformation
u Wavelength
Ranges:
– VIS: 400 - 700 nm
– IR1: 600 - 1080 nm
– IR2: 900 - 1700 nm
Introduction
The PAX1000 Polarimeters are flexible and powerful
Applications
polarization analysis systems. They are designed for
uFree-Space
applications ranging from classic polarization measurements
to complex tasks such as evaluating optical components
u ER
and Fiber-Coupled Polarimetry
Measurements on PM Fiber
with the Jones matrix algorithm. In addition, they are well
u DOP
Measurements
suited for determining the extinction ratio (ER) of polarization-
u Basic
Unit for Jones and Mueller Matrix Measurements
maintaining fibers and for alignment of PM fiber to laser
modules. The PAX1000 Series is specifically engineered for
accurate measurements of polarization-related effects over
SOP and DOP Measurements
high dynamic power ranges and broad wavelength ranges
The PAX1000 analyzes the state of polarization (SOP) and the
between 400 nm and 1700 nm. Each system consists of the
degree of polarization (DOP) of optical signals in either free
analyzer with an external sensor head for free-space and
space or optical fibers. The resulting data can be viewed
fiber-based optical systems. In contrast to our IPM5000 Series,
using the graphical user interface that is supplied with each
which allows transmission of the optical output, the PAX1000
PAX unit. The state of the input polarization is completely
Series uses all incident light for the measurement without any
characterized by different representations. The polarization
optical output.
data is presented in two forms: on the Poincaré sphere with
How It Works
The optical unit of a PAX1000 measurement sensor consists
of a rotating quarter-wave plate, a fixed polarizer, and
a photodiode (see schematic to the right). The wave
plate transforms the input polarization depending on
the orientation of the wave plate's optical axis. Then,
azimuth and ellipticity parameters, and as a polarization
ellipse with the handedness noted. The Stokes parameters
can be shown as well. The degree of polarization and the
total optical power are also provided.
Incoming
Light
Polarizer
the polarizer only transmits the portion of light that has its
polarization parallel to the transmission axis. As a result, the
polarization modulation is converted into an amplitude
modulation. The photodetector generates a current that is
proportional to the optical power. A Fourier transform is used
to accurately calculate both the state of polarization as well
as the degree of polarization.
Rotating
λ/4 Wave Plate
Schematic of Rotating Wave Plate Technique
Photodetector
System Configurations
The modular design of the PAX system makes it an ideal tool
for many polarization-related measurement tasks in R&D
laboratories as well as for quality inspection in manufacturing.
The PAX1000 Series can be used for free-space and fiberbased applications.
The PAX1000 is a standalone polarization analysis module with
an internal measurement sensor. It is available with an 8-32 or
M4 tapped hole on the bottom for post mounting and it is also
compatible with our extensive line of SM1 and 30 mm cage
system components. The optical light field to be measured
should enter the aperture of the sensor nearly perpendicular
Polarimeter Measurement Value Table
to the front panel. The beam diameter should be less than
3 mm to guarantee that all of the light reaches the detector.
Real-TIme, Long-Term Polarization Measurements
All sensors are supplied with a fiber collimator for FC/PC fiber
Another PAX1000 feature is the scope mode, which looks
patch cables to allow polarization measurements of fiber-
similar to an oscilloscope display. The polarization can be
based systems.
examined continuously over time, or acquisition can be
initiated with a software or hardware trigger signal. The
PAX1000 also offers a pre-trigger function, which can be
activated in each trigger mode. Using this function, a userconfigurable number of samples are stored in a ring buffer until
the trigger pulse is given, and all acquired data before and
after the trigger pulse are displayed in a diagram. Therefore,
real-time monitoring of the system’s polarization behavior can
Common Specificationsa
Input Power Rangeb
-60 dBm to +10 dBm
Azimuth Angle Accuracyc,d
0.25°
Ellipticity Angle Accuracy
0.25°
c
Normalized Stokes Accuracy
s1, s2, and s3 < 0.005
Degree of Polarization Accuracy
Maximum Measurement Rate
±0.5%
400 Samples/s
be realized with the PAX measurement system.
a.Valid for the power range from -40 dBm to +3 dBm.
The measured data can be stored in an ASCII file format
c.Azimuth angle is defined as the inclination of the major axis of the
polarization ellipse to the horizontal axis. The ellipticity angle is given as
arctan(b/a), where b is the length of the minor axis and a is the length of
the major axis of the polarization ellipse.
(CSV), allowing data file contents to be viewed with any
text editor. Data can be further processed using third-party
software packages such as MathCAD, Mathematica, or Excel.
PAX Sensors with Compatible SM1, 30 mm
Cage, and Fiber Accessories
b.Absolute power range depends on the current wavelength.
d.For any SOP with -30° < Ellipticity < 30°.
These products are in the final stages of development, and their
specifications are subject to change.
Worldwide Support
Thorlabs, Inc.
Newton, New Jersey
Phone: 1-973-300-3000
Fax: 1-973-300-3600
Email: [email protected]
www.thorlabs.com
Thorlabs Ultrafast
Optoelectronics
Thorlabs SAS France
Thorlabs Ltd.
Thorlabs Vytran Division
Thorlabs GmbH /
Thorlabs Lübeck
Thorlabs Vytran Europe
Ann Arbor, Michigan
Phone: 1-973-300-3000
Email: [email protected]­­­­
Thorlabs Imaging Systems
Morganville, New Jersey
Phone: 1-973-300-3000
Email: [email protected]­­­­
Sterling, Virginia
Phone: 1-703-651-1700
Email: [email protected]
Thorlabs Quantum
Electronics (TQE)
Thorlabs Canada
Thorlabs Scientific Imaging (TSI)
Thorlabs Ltda, Brazil
Phone: 1-973-300-3000
Fax: 1-973-300-3600
Email: [email protected]­­­­
Jessup, Maryland
Phone: 240-456-7100
Email: [email protected]
Austin, Texas
Phone: 1-973-300-3000
Email: [email protected]
Phone: +55 (16) 3413 7062
Fax: +55 (16) 3413 7064
Email: [email protected]
Phone: +33 (0) 970 444 844
Fax: +33 (0) 825 744 800
Email: [email protected]
Phone: +49 (0) 8131 5956-0
Fax: + 49(0) 8131 5956-99
Email: [email protected]
Thorlabs Elliptec GmbH
Phone: +498131-595640-880
Fax: +498131-595640-890
Email: [email protected]
Thorlabs Sweden AB
Phone: +46 31 733 30 00
Fax: +46 31 703 40 45
Email: [email protected]
56 Sparta Avenue • Newton, New Jersey 07860
Sales: 973.300.3000 • Fax: 973.300.3600 • www.thorlabs.com
Phone: +44 (0)1353 654440
Fax: +44 (0)1353 654444
Email: [email protected]­­­­
Phone: +44 (0) 1392-445777
Email: [email protected]
Thorlabs China Ltd.
Phone: +86 (0)21-60561122
Fax: +86 (0)21-32513480
Email: [email protected]
Thorlabs Japan
Phone: +81-3-5979-8889
Fax: +81-3-5979-7285
Email: [email protected]
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