HFP2500 Instruction Manual

HFP2500 Instruction Manual
Operator’s
Manual
HFP2500
High Frequency Probe
HFP2500 High Frequency Probe
Operator’s Manual
© 2013 Teledyne LeCroy, Inc. All rights reserved.
Unauthorized duplication of Teledyne LeCroy documentation materials other than for internal sales and
distribution purposes is strictly prohibited. However, clients are encouraged to distribute and duplicate
Teledyne LeCroy documentation for their own internal educational purposes.
WavePro, WaveRunner, and Teledyne LeCroy are registered trademarks of Teledyne LeCroy, Inc. Windows is a
registered trademark of Microsoft Corporation. Other product or brand names are trademarks or requested
trademarks of their respective holders. Information in this publication supersedes all earlier versions.
Specifications are subject to change without notice.
Warranty
Teledyne LeCroy warrants this oscilloscope accessory for normal use and operation within specification for a
period of one year from the date of shipment. Spare parts, replacement parts and repairs are warranted for 90
days.
In exercising its warranty, Teledyne LeCroy, at its option, will either repair or replace any assembly returned
within its warranty period to the Customer Service Department or an authorized service center. However, this
will be done only if the product is determined by Teledyne LeCroy’s examination to be defective due to
workmanship or materials, and the defect is not caused by misuse, neglect, accident, abnormal conditions of
operation, or damage resulting from attempted repair or modifications by a non-authorized service facility.
The customer will be responsible for the transportation and insurance charges for the return of products to
the service facility. Teledyne LeCroy will return all products under warranty with transportation charges
prepaid.
This warranty replaces all other warranties, expressed or implied, including but not limited to any implied
warranty of merchantability, fitness or adequacy for any particular purposes or use. Teledyne LeCroy shall not
be liable for any special, incidental, or consequential damages, whether in contract or otherwise.
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TABLE OF CONTENTS
Safety Instructions .................................................................................................. 1
Symbols ..................................................................................................................... 1
Precautions ............................................................................................................... 1
Operating Environment ............................................................................................ 2
Introduction ........................................................................................................... 2
Key Benefits .............................................................................................................. 3
Standard Accessories ................................................................................................ 3
Specifications.......................................................................................................... 4
Nominal Characteristics ............................................................................................ 4
Warranted Characteristics ........................................................................................ 5
Typical Characteristics .............................................................................................. 5
Environmental Characteristics .................................................................................. 5
Physical Characteristics ............................................................................................. 6
Features and Accessories ........................................................................................ 7
Features .................................................................................................................... 7
Accessory Descriptions ............................................................................................. 8
Operation ............................................................................................................. 14
Handling the Probe ................................................................................................. 14
Connecting the Probe to the Test Instrument ........................................................ 14
Connecting the Probe to the Test Circuit................................................................ 14
Operation with a Teledyne LeCroy Oscilloscope .................................................... 14
Use with Older Teledyne LeCroy Instruments ........................................................ 14
Offset ...................................................................................................................... 15
Care and Maintenance .......................................................................................... 16
Cleaning .................................................................................................................. 16
Calibration Interval ................................................................................................. 16
Service Strategy ...................................................................................................... 16
Returning a Defective Probe ................................................................................... 17
Replacement Parts .................................................................................................. 18
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HFP2500 High Frequency Probe
High Frequency Measurements ............................................................................. 19
Input Loading ........................................................................................................... 19
Inductive Loading (Lead Length) ............................................................................. 19
Capacitive Loading ................................................................................................... 20
Performance Verification ...................................................................................... 22
Test Equipment Required ........................................................................................ 22
Preliminary Procedure ............................................................................................. 23
Functional Check ..................................................................................................... 24
Procedure ................................................................................................................ 25
Adjustment Procedure .......................................................................................... 30
Test Equipment Required ........................................................................................ 31
Preliminary Procedure ............................................................................................. 32
Procedure ................................................................................................................ 32
Reference ............................................................................................................. 36
Contact Teledyne LeCroy ......................................................................................... 38
Appendix A ........................................................................................................... 39
Performance Verification Test Record .................................................................... 39
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Safety Instructions
This section contains instructions that must be observed to keep this oscilloscope accessory
operating in a correct and safe condition. You are required to follow generally accepted safety
procedures in addition to the precautions specified in this section. The overall safety of any system
incorporating this accessory is the responsibility of the assembler of the system.
Symbols
These symbols may appear on the probe body or in this manual to alert you to important safety
considerations.
WARNING. High Voltage, risk of electric shock.
CAUTION. Potential for damage to probe or instrument it is connected to. Attend to the
accompanying information to protect against personal injury or damage. Do not proceed
until conditions are fully understood and met.
ELECTROSTATIC DISCHARGE (ESD) HAZARD. The probe is susceptible to damage if antistatic measures are not taken.
DOUBLE INSULATION
PROTECTIVE (EARTH) TERMINAL
Precautions
To avoid personal injury or damage to probe or the instrument it is connected to, review and comply
with the following safety precautions.
Use product only as specified.
Connect and disconnect properly. Connect probe to the measurement instrument before
connecting the test leads to a circuit/signal being tested.
Use only accessories compatible with the probe. Use only accessories that are rated for the
application. Ensure connections between probe input leads and probe accessories are secure
before connecting them to a voltage source.
Comply with voltage derating curve. When measuring higher frequency signals, comply with the
Input Voltage vs. Frequency Curve (see Figure 1).
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HFP2500 High Frequency Probe
Do not overload. To avoid electric shock or damage to probe or instrument it is connected to, do
not apply any potential that exceeds the maximum rating of the probe and/or the probe accessory,
whichever is less. Observe all terminal ratings of the instrument before connecting the probe.
Be careful not to damage the insulation surface when making measurements.
Use only within operational environment listed. Do not use in wet or explosive atmospheres. Keep
product surfaces clean and dry. Use indoors only.
Handle with care. Probe accessory tips are sharp. They can puncture skin or cause other bodily
injury if not handled properly.
Keep fingers behind the finger guard of the probe accessories.
Do not operate with suspected failures. Before each use, inspect the probe and accessories for any
damage such as tears or other defects in the probe body, cable jacket, accessories, etc. If any part is
damaged, cease operation immediately and sequester the probe from inadvertent use.
Operating Environment
The accessory is intended for indoor use and should be operated in a clean, dry environment. Before
using this product, ensure that its operating environment is maintained within these parameters:
Temperature: 0° to 50° C.
Humidity: ≤ 80% max up to 31 °C, decreasing linearly to 45% max at 50 °C
Altitude: up to 2000 m (6562 feet)
Introduction
The 2.5 GHz HFP2500 is a small, high frequency active probe designed to meet today’s increasing
demand for measurements on a variety of test points.
With low input capacitance and high input resistance, circuit loading is minimized.
The HFP2500 can be used with Teledyne LeCroy’s WavePro™ and Waverunner™ series oscilloscopes,
and LC series oscilloscopes with firmware version 8.7.0 or higher.
When the probe is used with any of these oscilloscopes, an AutoColor ID feature automatically
illuminates the probe head in the default trace color of the channel to which the probe is connected,
eliminating the need for color bands or other markers.
With the ProBus interface, the HFP2500 becomes an integral part of the oscilloscope. The probe can
be controlled from the oscilloscope’s front panel. The oscilloscope provides power to the probe, so
there is no need for a separate power supply or batteries.
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Key Benefits
•
High frequency performance
•
Low input capacitance
•
Wide dynamic range
•
ProBus interface
•
AutoColor ID feature matches the probe color to the oscilloscope’s default trace color
•
Five interchangeable tips for probing a variety of test points
•
Replaceable probe tip socket
•
Hands free probing with FreeHand Probe Holder
Standard Accessories
The HFP2500 probe is shipped with the following standard accessories:
Item:
Quantity:
Wire Assembly, Black
1
Mini Clip, Black
2
Micro Clip, 0.5 mm
2
Socket Cartridge Assembly
1
Low C Cartridge Assembly
1
Short Right Angle Lead
1
Long Right Angle Lead
1
Square Pin Ground Spring
1
IC Lead Tip
4
SMD Discrete Tip
4
Straight Tip
4
Sharp Tip
4
Bent Sharp Tip
4
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HFP2500 High Frequency Probe
Leaf Pogo Ground Assembly
1
Pogo Ground Lead
2
Pivot Ground Lead
2
FreeHand Probe Holder
1
Soft Accessory Case
1
Instruction Manual
1
Certificate of Calibration
1
For part number information refer to page 18, Replaceable Parts List.
Specifications
Nominal Characteristics
Nominal characteristics describe parameters and attributes that are guaranteed by design, but do
not have associated tolerances.
1
4
Input Dynamic Range
±8 V
Offset Range
±12 V 1
Maximum Input Voltage1
40 V pk
Attenuation
÷10
Output Connector
ProBus
Interface
ProBus
Oscilloscope Full Compatibility
All Teledyne LeCroy WaveRunner and Wave
Pro oscilloscopes, and LC series
oscilloscopes with firmware version 8.7.0 or
higher.
Subject to input voltage vs. frequency derating. See Figure 1.
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Warranted Characteristics
Warranted characteristics are parameters with guaranteed performance. Unless otherwise noted,
tests are provided in the Performance Verification Procedure for all warranted specifications.
Low Frequency
Attenuation Accuracy
±1% plus uncertainty of 50 Ω termination
Output Zero
≤ 8 mV, referred to the input
Offset Accuracy
±1%±Output Zero error, referred to the input
Typical Characteristics
Typical characteristics are parameters with no guaranteed performance. Tests for typical
characteristics are not provided in the Performance Verification Procedure.
Output Zero
≤ 4 mV, referred to the input
Bandwidth (Probe only)
2.5 GHz
Input Capacitance
0.7 pF
DC Input Resistance
100 kΩ
Environmental Characteristics
Operating temperature
0 °C to 50 °C
Storage temperature
-40 °C to 71 °C
Relative Humidity
80% max up to 31 °C,
decreasing linearly to 45% max
at 50 °C
Altitude
up to 2000 m
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HFP2500 High Frequency Probe
Physical Characteristics
Probe Head Size:
Length
61 mm (2.4 in)
Width
7.3 mm (0.29 in)
Height
13.1 mm (0.52 in)
Cable Length
1.3 m (51.1 in)
Weight:
Probe only
100 g (3.5 oz.)
Shipping
1.45 kg (3.19 labs)
Input Sockets
Signal and ground sockets are compatible
with 0.635 mm (0.025 in) square pins, and
0.91 mm (0.036 in) maximum diameter
round pins
Figure 1, Input Voltage vs. Frequency
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Features and Accessories
The HFP2500 probe is provided with numerous features and accessories to make probing and
connecting to different test points easier than ever.
Features
Probe Head
The small, low mass probe head is designed for ease of use and
high performance.
The probe tip socket fits easily onto 0.025 inch square pins for
direct access to test points. Several different adapters are
available which connect directly in the probe socket.
The probe tip socket has a removable tip cartridge for easy
replacement in case the probe socket gets damaged.
The ground socket will accept several different ground leads to
provide a short ground path for high frequency performance.
AutoColor ID
The AutoColor ID consists of an LED inside the probe head which
illuminates the probe body in the default trace color of the
channel to which the probe is connected.
The AutoColor ID will only function when the probe is connected
to a Teledyne LeCroy oscilloscope supplied with the ProBus
interface and firmware version 8.7.0 or higher. The colors are
correct when factory default color scheme 1 is selected.
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HFP2500 High Frequency Probe
Accessory Descriptions
The following Tip and Clip accessories can be pushed into the
probe tip socket, ground socket or any other socketed lead or
adapter.
Tips
STRAIGHT TIP
The straight tip is rugged and designed for general probing. Fits in
either probe socket.
PACC-PT001, package of 4.
SHARP TIP
Rugged, titanium tip designed to connect to the smallest vias and
small test points. Fits in either probe socket.
PACC-PT002, package of 4.
IC LEAD TIP
Covered in insulation on all sides (except for a small edge), this tip
was designed to prevent shorting neighboring IC leads. The gold
part of the tip is not insulated and should touch the IC lead to be
tested. It is one-size-fits- all and will work with any IC lead pitch.
Fits in either probe socket.
PACC-PT003, package of 4.
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Tips, continued
SMD DISCRETE TIP
The crescent shape of this tip is designed to fit tightly on capacitors,
resistors, transistors and other surface mount components with
discrete leads. Fits in either probe socket.
The SMD Discrete Tip is an optional accessory for the HFP2500.
PACC-PT004, package of 4.
BENT SHARP TIP
Made out of titanium, this tip is ideal for situations that require the
user to hold the probe parallel to the circuit board under test. Also
gives the user more control when holding the probe like a pencil. Fits
in either probe socket.
PACC-PT005, package of 4.
Clips
MICRO CLIP (0.5 MM)
A pincher like tip designed to hold onto fine pitch leads and small
components, commonly found in SMD ICs. Fits in either probe
socket, or can be used with a lead.
The Micro Clip is an optional accessory for the HFP2500.
PACC-CL001, package of 4.
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HFP2500 High Frequency Probe
Clips, continued
CLIP (0.8 MM)
A pincher like tip designed to hold onto larger wires and
components than possible with the Micro Clip, including
through-hole mounted components.
This clip cannot be connected directly into either of the probe
head sockets; it must be connected to a lead.
PK006-4, package of 2.
SQUARE PIN GROUND SPRING
A flexible spring connected to a square pin that fits into either
of the probe sockets. Designed to be attached to a square pin
on the circuit under test.
PACC-LD002, package of 4.
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Leads
While longer leads provide greater flexibility when connecting the probe to a circuit, the added
inductance may degrade the fidelity of high frequency signals.
SHORT AND LONG RIGHT ANGLE LEAD
This lead has a socket on one end and a bent square pin on
the other to connect to the input or ground socket of the
probe body, and may be used for general purpose probing.
PACC-LD003 (short), PACC LD004 (long), packages of 4.
LEAF POGO GROUND ASSEMBLY
Flexible ground lead that can be pushed between two pins
of an smd component and will make contact with one of
them.
PACC-CD009, package of 1.
POGO SPRING LEAD
Bendable ground lead with pogo pin at the end.
PACC-CD008, packageof 2.
PIVOT GROUND LEAD
Ground lead wire that can be soldered to the board. It has a
pin that fits into the probe ground socket.
PACC-CD007, package of 2.
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HFP2500 High Frequency Probe
Probe Holder
The FreeHand Probe Holder lets you focus on the
oscilloscope screen instead of on maintaining contact to
multiple test points. It allows the user to concentrate on
what is really important – the waveform.
It is designed to keep most of the weight on the probe tip
and will prevent lost contact when a bump to the table
shakes the circuit under test.
Additionally, the HFP probe can be mounted horizontally or
vertically in the FreeHand, giving added measurement
flexibility.
PACC-MS001, package of 1.
To use the FreeHand probe holder
1. Slide the probe cable through the slot on the bottom of
the translucent holder section.
2. Slide probe backwards in the probe holder.
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Cartridges
REPLACEABLE SOCKET CARTRIDGE
If the input tip socket gets damaged, you don’t have to
replace the entire probe, because the HFP series active
probe has a removable tip socket cartridge.
PACC-MS002, package of 1.
Removal and Installation of the Replaceable Cartridge
To remove old cartridge:
1. Slide the cable strain relief over the cable away
from the probe body.
2. To release the latch, lift the part closest to the
strain relief away from the probe body and slide
the cartridge toward the strain relief.
To install a new cartridge:
1. Slide the new cartridge onto the probe body
until the latch engages.
2. Slide the cable strain relief forward to cover the
back end of the probe body.
HIGH FREQUENCY CARTRIDGE
By having a fixed tip rather than a socket, the High Frequency cartridge is able to increase signal
fidelity at higher frequencies.
The High Frequency Cartridge is an optional accessory for the HFP2500.
PACC-MS003, package of 1.
NOTE: The cable strain relief is polarized and fits over the probe body in one direction only.
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HFP2500 High Frequency Probe
Operation
Handling the Probe
Exercise care when handling and storing the probe. Always handle the probe by the probe body or
compensation box. Avoid putting excessive strain or exposing the probe cable to sharp bends.
Connecting the Probe to the Test Instrument
The HFP2500 probe has been designed for use with Teledyne LeCroy’s WavePro™, Waverunner™
and LC oscilloscopes equipped with the ProBus interface. When you attach the probe output
connector to the oscilloscope’s input connector, the oscilloscope will recognize the probe, provide
proper termination and activate the probe control functions in the user interface.
Connecting the Probe to the Test Circuit
To maintain the high performance capability of the probe in measurement applications, care must
be exercised in connecting the probe to the test circuit. Increasing the parasitic capacitance or
inductance in the input paths may introduce a “ring” or slow the rise time of fast signals. Input leads
which form a large loop area will pick up any radiated electromagnetic field which passes through
the loop and may induce noise into the probe input.
Using one of the available accessories makes the HFP2500 probe with its small profile and low mass
head ideally suited for applications in dense circuitry.
Operation with a Teledyne LeCroy Oscilloscope
When the HFP2500 probe is connected to any Teledyne LeCroy oscilloscope, the displayed scale
factor and measurement values will be automatically adjusted. Control through the oscilloscope’s
interface can be found in the ’Coupling’ menu of the channel to which the probe is connected.
Turning the Volts/Div knob will control the oscilloscope’s scale factor to give full available dynamic
range up to 2 V/div.
Use with Older Teledyne LeCroy Instruments
When used with Teledyne LeCroy instruments with software version lower than 8.7.0, the
oscilloscope will provide the correct scale factor but no AutoColor ID. Probe offset is also disabled.
Because the probe offset is not being used, the linear operating range is limited to ±8 Volt.
With V/div settings greater than 2 V/div, it is possible to display clipped waveforms on screen.
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Offset
The HFP2500 has true offset capability. This allows you to remove a DC bias voltage from the input
signal while maintaining DC coupling. By using probe offset rather than the Position control on the
oscilloscope, the full dynamic range of the probe remains centered around the offset level,
preventing the oscilloscope from being overdriven and causing inaccurate measurements.
Figure 2, Dynamic Range and Offset Effects
With ±8 V dynamic range and ±12 V offset, the HFP2500 has a measurement range of ±20 V.
When the HFP2500 is used with a Teledyne LeCroy oscilloscope equipped with ProBus interface, the
probe offset is controlled with the channel OFFSET knob.
NOTE: At higher frequencies the maximum linear input voltage is reduced. Refer to Specifications
for the derating curve.
Probe offset is controlled with the channel OFFSET knob in oscilloscopes with software version 8.7.0
or higher. The current offset is displayed above the graticule for a few seconds after a change has
been made.
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HFP2500 High Frequency Probe
Care and Maintenance
Cleaning
The exterior of the probe and cable should be cleaned only using a soft cloth lightly moistened with
water or isopropyl alcohol. The use of abrasive agents, strong detergents, or other solvents may
damage the probe. Always ensure that the input leads are free of debris.
The probe case is not sealed and should never be immersed in any fluid.
Calibration Interval
The recommended calibration interval is one year. (Performance Verification and Adjustment
Procedures are included in this manual.)
Service Strategy
The HFP2500 probe utilizes fine pitch surface mount devices. It is therefore impractical to attempt
to repair in the field. Defective probes must be returned to a Teledyne LeCroy service facility for
diagnosis and exchange. A defective probe under warranty will be replaced with a factory
refurbished probe.
A probe that is not under warranty can be exchanged for a factory refurbished probe for a modest
fee. You must return the defective probe in order to receive credit for the probe core.
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Returning a Defective Probe
Contact your local Teledyne Lecroy sales representative to find out where to return the product. All
returned products should be identified by model number and serial number. Provide your name and
contact number and if possible describe the defect or failure. In case of products returned to the
factory, a Return Authorization Number (RAN) must be used. Contact your nearest Teledyne Lecroy
office, or the New York Customer Care Center, to receive a RAN.
Return shipment should be prepaid. Teledyne Lecroy cannot accept COD or Collect Return
shipments. We recommend air-freighting.
1. Contact your local Teledyne Lecroy sales or service representative to obtain a Return
Authorization Number.
2. Remove all accessories from the probe. Do not include the manual.
3. Pack the probe in its case, surrounded by the original packing material (or equivalent) and
box it.
4. Label the case with a tag containing:
• The RAN
•
Name and address of the owner
•
Probe model and serial number
•
Description of failure
5. Package the probe case in a cardboard shipping box with adequate padding to avoid
damage in transit.
6. Mark the outside of the box with the shipping address given to you by the Teledyne Lecroy
representative; be sure to add the following:
• ATTN: <RAN assigned by the Teledyne Lecroy representative>
•
FRAGILE
7. Insure the item for the replacement cost of the probe.
8. If returning a probe to a different country, also:
 Mark shipments returned for service as a “Return of US manufactured goods for
warranty repair/recalibration.”

If there is a cost involved in the service, put the service cost in the value column and
the replacement value in the body of the invoice marked “For insurance purposes
only.”

Be very specific as to the reason for shipment. Duties may have to be paid on the
value of the service.
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HFP2500 High Frequency Probe
Replacement Parts
The probe connection accessories and other common parts can be ordered through the regional
customer care centers. Refer to list below for Teledyne LeCroy part numbers. Defective probes can
be replaced on an exchange basis. The replacement exchange probe will have been factory repaired,
inspected and calibrated to the same standards as a new product. In order to obtain an exchange
probe, you must return the defective probe. The returned probe should be sent back to the regional
customer care center without any accessories, manual or case.
Table 1: Replaceable Parts List
Item
18
Teledyne LeCroy P/N
Replacement QTY
Wire Assembly, Black
PACC-LD005
1
Mini Clip, Black
PK006-4
2
Micro Clip
PACC-CL001
2
Socket Cartridge Assembly
PACC-MS002
1
Low C Cartridge Assembly
PACC-MS003
1
Short Right Angle Lead
PACC-LD003
1
Long Right Angle Lead
PACC-LD004
1
Square Pin Ground Spring
PACC-LD002
1
IC Lead Tip
PACC-PT003
4
SMD Discrete Tip
PACC-PT004
4
Straight Tip
PACC-PT001
4
Sharp Tip
PACC-PT002
4
Bent Sharp Tip
PACC-PT005
4
Leaf Pogo Ground Assembly
PACC-CD009
1
Pogo Ground Lead
PACC-CD008
2
Pivot Ground Lead
PACC-CD007
2
FreeHand Probe Holder
PACC-MS001
1
Soft Accessory case
SAC-01A
1
Instruction Manual
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Certificate of Calibration
922415-CC
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High Frequency Measurements
Input Loading
When you touch a probe to the circuit under test, the probe will affect your measurement because
of the probe’s input impedance introduced into the circuit. All probes present resistive, capacitive
and inductive loading.
Inductive Loading (Lead Length)
A significant element in this circuit is the inductance shown in the input ground leads of the
oscilloscope probe.
Figure 3 Probe Input Equivalent Circuit
The ground lead is the primary return path for the current resulting from the input voltage acting on
the probe’s input impedance. The ground lead and input lead inductances act with the probe’s input
capacitance to form series L-C network. The impedance of a series LC network will drop dramatically
at its resonant frequency. This is the cause of the "ring" we often see after the leading edge of
pulses in measured waveforms. This effect is referred to as ground lead corruption. Because it is
impossible to eliminate either the L or C from this circuit, the method to improve waveform fidelity
is to raise the resonant frequency beyond the bandwidth of interest in the measurement.
The resonant frequency of a simple LC circuit can be represented by:
The resonant frequency of a series LC circuit can be raised by decreasing the inductance,
capacitance or both.
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HFP2500 High Frequency Probe
Since the input capacitance is already very low and cannot be reduced, you can only try to reduce
the inductance. This can be accomplished by using the shortest possible input lead as well as the
shortest possible ground lead.
For example, to obtain the shortest possible ground lead when measuring IC related signals, attach a
small piece of copper clad material to the top of the IC package and connect this to the package
grounding wires. Using the shortest ground lead and input lead available makes probing signals on
the package easier and makes for the shortest lead length for the best signal fidelity.
To illustrate how dramatic this effect is, we will work a simple example.
Assuming an input capacitance of 0.7 pF and a total lead length (input and ground) of 2 inches
(inductance of ≈ 25 nH/inch) such a setup may cause ringing with a resonant frequency (f0) of:
This frequency is well within the passband of the probe and will therefore show up as part of the
measured signal at faster time/div settings.
To determine how fast a waveform to be measured can be without causing ringing on a probe
like,this divide the BW (ringing frequency) of the probe into 0.35:
Any input signal with a rise time faster than 0.4 ns can cause ringing.
Capacitive Loading
Capacitive loading is usually the most troublesome of the three loading effects.
It can affect the rise time, bandwidth and delay time measurements.
At higher frequencies the capacitive loading can affect the amplitude as well as the waveshape of
the measured signal by introducing an exponential response to the waveform.
For a simple RC network the time constant of this exponential response is:
where Ctotal is the combined probe and circuit capacitance and Rtotal is combined circuit and probe
resistance.
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For a setup where Ct = 0.7 pF and a source resistance is 250 Ω, the measured rise time will be 0.385
ns, which will correspond to a bandwidth of 909 MHz, assuming no inductive loads.
(trise=2.2 x 0.7 X 10-12 x 250 Ω = 0.385 ns)
(parallel combination of 250 Ω and 100 kΩ is still 250 Ω)
Figure 4, Probe Input Equivalent Circuit
To illustrate the effect of capacitive loading at higher frequencies:
At a frequency of 851 MHz the reactance of the 0.7 pF capacitance is 267 Ω, and at 1.5 GHz the
reactance has been lowered to 152 Ω.
If, at a given frequency, the source impedance is large with respect to the input impedance, a
measurable reduction in the output signal amplitude may occur.
where: Zprobe is the probe’s input impedance and Zsource is the source impedance.
For example: at 851 MHz, where the probe input impedance has reduced to 267 Ω, and a source
resistance of 250 Ω the probe output amplitude is reduced to:
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HFP2500 High Frequency Probe
Performance Verification
This procedure can be used to verify the warranted characteristics of the HFP2500 High Frequency
Probe.
The recommended calibration interval for the model HFP2500 is one year. The complete
performance verification procedure should be performed as the first step of annual calibration. Test
results can be recorded on a photocopy of the Test Record provided in Appendix A at the end of the
manual.
Performance verification can be completed without removing the probe covers or exposing the user
to hazardous voltages. Adjustment should only be attempted if a parameter measured in the
Performance Verification Procedure is outside the specification limits.
NOTE: Adjustment should only be performed by qualified personnel.
This procedure tests the following specifications:
•
Output Zero Voltage
•
Offset Accuracy
•
LF Attenuation Accuracy
Test Equipment Required
Table 2: List of Required Equipment lists the test equipment and accessories (or their equivalents)
that are required for performance verification of the HFP2500 Probe.
This procedure has been developed to minimize the number of calibrated test instruments required.
Only the parameters listed in boldface in the "Minimum requirements" column must be calibrated
to the accuracy indicated.
Because the input and output connectors types may vary on different brands and models of test
instruments, additional adapters or cables may be required.
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Table 2: List of Required Equipment
Description
Minimum Requirements
Example Test Equipment
Digital Oscilloscope
ProBus interface
Teledyne LeCroy WavePro960
Teledyne LeCroy LT344
Digital Multimeter (DMM) with
test probe leads
4.5 digit
Agilent Technologies 34401A
DC: 0.1% Accuracy
AC: 0.1% Accuracy
Fluke 8842A-09
Function Generator
Sine Wave output amplitude
adjustable to 14.14 Vp-p (5 Vrms)
into 1 MΩ at 70 Hz
Agilent Technologies 33120A
Stanford Research Model DS340
Power Supply
0-12 V, settable to 10 mV
HP E3611A
BNC Coaxial Cable (2 ea.)
Male to Male, 50 Ω, 36" Cable
Pomona 2249-C-36
Pomona 5697-36
BNC Tee Connector
Male to Dual Female
Pomona 3285
Calibration Fixture
ProBus Extender Cable
Teledyne LeCroy PROBUS-CF01
Terminator, Precision, BNC
50 Ω ± 0.05%
Teledyne LeCroy TERM-CF01
Banana Plug Adapter (2 ea.)
Female BNC to Dual Banana Plug
Pomona 1269
BNC to Mini-grabber
BNC Male to Mini-grabber Cable,
36"
Pomona 5187-C-36
Preliminary Procedure
1. Connect the HFP2500 probe to the female end of the ProBus Extension Cable. Connect the
male end of the ProBus Extension Cable to channel 1 of the oscilloscope.
2. Turn the oscilloscope on and allow at least 30 minutes warm-up time for theHFP2500 and
test equipment before performing the Verification Procedure.
3. Turn on the other test equipment and allow these to warm up for the time recommended
by the manufacturer.
4. While the instruments are reaching operating temperature, make a photocopy of the
Performance Verification Test Record (located in Appendix A), and fill in the necessary data.
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HFP2500 High Frequency Probe
5. Select the channel to which the probe is connected. Set the oscilloscope scale factor to
20mV/div.
6. Disconnect the ProBus Extender Cable from the oscilloscope. Verify that the scale factor
changes from 20 mV/div to 2 mV/div.
7. Re-connect the ProBus extender Cable to the oscilloscope.
The warranted characteristics of the HFP2500 are valid at any temperature within the
Environmental Characteristics listed in the Specifications. However, some of the other test
equipment used to verify the performance may have environmental limitations required to meet
the accuracy needed for the procedure. Make sure that the ambient conditions meet the
requirements of all the test instruments used in his procedure.
NOTE: The correct operation of the HFP2500 controls requires software version 8.7.0 or higher on
LC series scopes. The software version in the test oscilloscope can be verified by pushing SCOPE
STATUS, then selecting the System menu option.
Functional Check
The functional check will verify the basic operation of the probe functions. It is recommended the
Functional Check be performed prior to the Performance Verification Procedure.
1. Return to the factory default settings by:
a. Pressing the oscilloscope’s front panel PANELS button.
b. From the Menu buttons press FROM DEFAULT SETUP.
2. Select Channel 1 and enter the Coupling menu.
3. Verify that Probe sensed (HFP2500) is displayed on the right hand menu.
4. If the trace colors have been reassigned or you are unsure, restore the default colors by
pressing the following menus: DISPLAY, More Display Setup, Color Scheme and in the Color
Scheme menu press 1.
5. Verify that the probe head LED shows basically the same color as the channel 1 trace color.
6. Disconnect the probe from channel 1 and connect respectively to channel 2, 3 and 4.
7. Verify that in each case the LED color corresponds to the trace color of the channel to which
the probe is connected.
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Procedure
A. Output Zero Voltage
Figure 5, Output Zero Voltage Test Setup
1. Connect one end of a BNC cable to the female BNC connector on the probe end of the
ProBus extender cable. Connect the precision 50 Ω terminator to the other end of the BNC
cable.
2. Connect the banana plugs of the Precision terminator to the input of the DMM. Make sure
that the plug corresponding to the BNC shield (marked "Ground") is connected to the LO or
COMMON input of the DMM. Refer to Figure 5, Output Zero Voltage Test Setup for setup
information.
3. Set the OFFSET on the oscilloscope to zero, as indicated by on-screen display.
4. Set the DMM to read DC Volt on the most sensitive range.
5. Record the voltage measured on the DMM to 10 μV resolution as ’Output Zero Voltage’ in
the Test record.
6. Check that the voltage indicated by the DMM is between ±800 μV.
7. Disconnect the DMM from the precision 50 Ω terminator. Leave the remaining setup in
place for the next step.
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HFP2500 High Frequency Probe
B. LF Attenuation Accuracy
Figure 6, Attenuation Accuracy Test Setup
1. Connect the BNC end of the BNC to mini-grabber cable to a female end of the BNC tee
adapter. (Refer to Figure 6, Attenuation Accuracy Test Setup).
2. Carefully insert the Straight Tips (supplied in accessory kit) into the sockets of the probe
head. Attach the red lead of the mini-grabber to the signal input and the black lead to the
ground input of the probe head.
3. Set the power supply to approximately 0 Volt.
4. Plug the dual banana plug adapter with probe attached into the output terminals of the
power supply with ground side of the adapter (and the ground side of the probe head)
connected to the positive terminal of the power supply.
5. Attach a BNC cable to the unused female port of the BNC tee and a dual banana plug
adapter to the other end of the cable and plug the dual banana plug adapter into the DMM
input. Make sure the side of the banana plug adapter corresponding to the BNC shield
(marked "GROUND") is connected to the LOW or COMMON input of the DMM.
6. Adjust the power supply to an output of 10.0 V ± 100 mV as indicated on the DMM.
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7. Record the DMM reading, which should be a negative number, to 10 mV resolution as
’Power Supply Negative Output Voltage’ in the Test Record.
8. Add 10 (to correct for the +10 V offset as described in step B-13) to the ’PS Negative Output
Voltage’ recorded in step B-7. (Do NOT adjust the power supply output amplitude).
9. Divide the resulting sum by 10.
10. Record the answer to three significant places as ’Expected Negative Output Voltage" in the
test record.
11. Remove the banana plug adapter, connected to the power supply, from the DMM and
connect the precision 50 Ω terminator to the DMM, making sure that the banana plug side
marked ’GROUND" is connected to the LOW or COMMON input of the DMM.
12. Set the DMM to read DC Volt on the most sensitive range.
13. Verify that the display for channel 1 is turned ON. Turn the oscilloscope OFFSET knob to
read +10.00 V on the oscilloscope display.
14. After the DMM has settled, record the reading to 100 μV resolution as ’Measured Negative
Output Voltage’ in the Test Record.
15. Subtract the measured voltage as recorded in step B-14 from the expected output voltage
recorded in step B-10. Be sure to include the sign of each of the values in the calculation.
16. Record the answer to three significant places as ’Offset Error Voltage’ in the Test Record.
17. Verify that the error is between ±10.8 mV.
NOTE: The error term is derived from the Offset Accuracy specification of ±1% ±8 mV. Using
a 10.0 V offset setting, the maximum error would be 108 mV referred to the input, which
becomes ±10.8 mV error referred to the output (taking into account the ÷10 attenuation).
18. Using the oscilloscope’s OFFSET knob, set the probe offset to 0 V, as indicated in the
onscreen display.
19. Remove the dual banana plug adapter with the HFP2500 attached from the power supply
and reconnect to the supply but now with the grounded side of the banana plug (and
grounded socket of the probe head) connected to the negative terminal of the power
supply output.
20. Disconnect the DMM from the precision 50 Ω terminator and connect the DMM to the dual
banana plug adapter connected to the power supply output.
21. Record the DMM reading, which should be a positive number, to 10 mV resolution as
’Power Supply Positive Output Voltage’ in the Test Record.
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HFP2500 High Frequency Probe
22. Subtract 10 from the output voltage recorded in step B-21. Divide this number by 10.
23. Record the result to three significant places as ’Expected Positive Output Voltage’ in the Test
Record.
24. Set the oscilloscope OFFSET to –10.00 V as read on the oscilloscope display.
25. Remove the banana plug adapter from the DMM and connect the precision 50 Ω terminator
to the DMM, making sure that the banana plug side marked ’GROUND" is connected to the
LOW or COMMON input of the DMM.
26. Record the DMM reading to three significant places as ’Measured Positive Output Voltage’
in the Test Record.
27. Subtract the Measured Output Voltage as recorded in step B-26 from the Expected Output
Voltage recorded in step B-23. Be sure to include the sign of the values in the calculation.
28. Record the result to 100 μV resolution as ’Offset Error Voltage’ in the Test Record.
29. Verify that the output error is between ±10.8 mV.
30. Return the oscilloscope offset to 0 Volt. Leave the setup connections for the next step.
C. LF Attenuation Accuracy
1. Disconnect the BNC tee at the power supply from the dual banana plug adapter. Connect
the BNC tee to the output of the function generator. (Use a 50 Ω termination if the function
generator requires such a load).
2. Disconnect the DMM from the precision 50 Ω terminator and connect the DMM to the dual
banana plug adapter connected to the function generator output.
3. Set the DMM to read AC Volt and set the range to measure 5.0 Vrms.
4. Set the mode of the function generator to sine wave, the frequency to 70 Hz and the output
amplitude to 5 Vrms ±10 mV as measured on the DMM.
5. Record the output voltage to 1 mV resolution as ’Generator Output Voltage’ in the Test
Record. Be careful not to alter the output amplitude after the reading is recorded.
6. Divide the reading recorded in step C-5 by 10 and record the result with 100 μV resolution
as ’Expected Output Voltage, top range" in the Test Record.
7. Remove the banana plug adapter, connected to the function generator, from the DMM and
connect the precision 50 Ω terminator to the DMM, making sure that the banana plug side
marked ’GROUND" is connected to the LOW or COMMON input of the DMM.
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8. After the DMM reading has stabilized, record the reading to 100 μV resolution as ’Measured
Output Voltage, top range’ in the Test Record.
9. Calculate the error by dividing the measured output voltage recorded in step C-8 by the
expected top output voltage recorded in step C-6. Subtract 1 from this ratio and multiply by
100% to get the error in percent.
10. Record the calculated error to two decimal places (±0.xx%) as ’Gain Error, top range’ in the
test record.
11. Verify that the error is less than ±1.0 %.
12. Disconnect the precision 50 Ω terminator from the DMM.
13. Connect the banana plug adapter connected via a BNC cable to the BNC tee at the function
generator to the DMM. Verify that the side of the plug marked ’Ground’ is connected to the
LOW or COMMON input of the DMM.
14. Adjust the sine wave generator output amplitude to approximately 2.5 Vrms as measured
on the DMM.
15. Record the reading to 1 mV resolution as ’Generator Output Voltage, mid range’ in the Test
Record. Be careful not to alter the output amplitude after the reading is recorded.
16. Divide the reading recorded in step C-15 by 10.
17. Record the result to 100 μV resolution as ’Expected Output Voltage, mid range’ in the test
record.
18. Remove the banana plug adapter from the DMM and connect the precision 50 Ω terminator
to the DMM, making sure that the banana plug side marked ’GROUND" is connected to the
LOW or COMMON input of the DMM.
19. After the DMM has stabilized, record the reading to 100 μV resolution as ’Measured Output
Voltage, mid range’ in the Test record.
20. Calculate the error by dividing the measured output voltage recorded in step C-19 by the
expected top output voltage recorded in step C-17. Subtract 1 from this ratio and multiply
by 100% to get the error in percent.
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HFP2500 High Frequency Probe
21. Record the calculated error to two decimal places (±0.xx %) as ’Gain Error, mid range’ in the
Test record.
22. Verify that the mid range gain error is less than ±1.0%
This completes the Performance Verification of the HFP2500. Complete and file the Test Record, as
required to support your internal calibration procedure.
Apply suitable calibration label to the HFP2500 housing as required.
Adjustment Procedure
You can use this procedure to adjust the HFP2500 probe to meet the warranted specifications. This
procedure should only be performed if the probe fails to meet the Performance verification tests for
Output Zero or Offset Accuracy.
Gain which affects LF attenuation accuracy cannot be adjusted during routine calibration. Probes
which fail LF frequency accuracy during performance verification must be returned to the factory for
rework.
To assure probe accuracy, check the calibration of the HFP2500 every 1000 hours or once a year if
used infrequently. Before calibration, thoroughly clean and inspect the probe as outlined in the Care
and Maintenance section.
To assure the probe will meet the published specifications over the entire temperature range,
adjustment must be performed in a controlled ambient environment with temperature of
23 °C ±5 °C.
CAUTION: The adjustment procedure will require removal of the probe control circuit
cover. This cover is part of the ESD protection system of the HFP2500. To protect the probe,
you should perform the entire procedure on a static dissipating work surface. Wear an
antistatic wrist strap and follow standard static control procedures.
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Test Equipment Required
Table 3: Required Equipment lists the test equipment and accessories (or their equivalents) that are
required for complete calibration of the HFP2500 Probe. Specifications given for the test equipment
are the minimum necessary for accurate calibration. All test equipment is assumed to be correctly
calibrated and operating within the specification listed. Detailed operating instructions for the test
equipment are not given in this procedure. Refer to the test equipment manual if more information
is needed
If alternate test equipment is substituted, control settings or calibration equipment setups may
need to be altered.
Table 3: Required Equipment for Adjustment Procedure
Description Examples
Minimum Requirements
Example Test Equipment
Digital Oscilloscope
ProBus interface
Teledyne LeCroy WavePro960
Teledyne LeCroy LT344
Digital Multimeter (DMM)
with test probe leads
4.5 digit
DC: 0.1% Accuracy
AC: 0.1% Accuracy
Agilent Technologies 34401A
Fluke 8842A-09
Power Supply
0-12 V, settable to 10 mV
HP E3611A
BNC Coaxial Cable (2 ea.)
Male to Male, 50 Ω, 36" Cable
Pomona 2249-C-36 or
Pomona 5697-36
BNC Tee Connector
Male to Dual Female
Pomona 3285
Calibration Fixture
ProBus Extender Cable
Teledyne LeCroy PROBUS-CF01
Terminator, Precision, BNC
50 Ω ± 0.05%
Teledyne LeCroy TERM-CF01
Banana Plug Adapter (2 ea.)
Female BNC to Dual Banana Plug
Pomona 1269
BNC to Mini-grabber
BNC Male to Mini-grabber Cable,
36"
Pomona 5187-C-36
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HFP2500 High Frequency Probe
Preliminary Procedure
1. Remove the two screws that secure the plastic cover on the cable end of the ProBus
interface housing.
2. Gently pull on the probe cable to slide the circuit board assembly from the metal housing.
3. Connect the HFP2500 probe to the female end of the ProBus extension cable, being careful
to line up all six pins of the probe connector. Connect the male end of the ProBus extension
cable to channel 1 of the oscilloscope.
4. Apply power to the oscilloscope and test equipment.
5. Allow at least 30 minutes warm-up time for the HFP2500 and test equipment before starting
the calibration procedure.
Procedure
Adjust Output Zero
Figure 7 Output Zero Voltage Adjustment Setup
1. Connect one end of a BNC cable to the probe end of the ProBus extension cable. Connect
the Precision 50 Ω Terminator to the other end of the BNC cable.
2. Connect the banana plugs of the precision 50 Ω terminator to the input of the DMM. Make
sure the plug corresponding to the BNC shield (marked ’Ground’) is connected to the LO or
COMMON input of the DMM. Refer to Figure 7 Output Zero Voltage Adjustment Setup for
setup information.
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3. Select the channel to which the probe and ProBus extender is connected. Set OFFSET on the
oscilloscope to zero as indicated on the on-screen display.
4. Set the DMM to read DC Volt on the most sensitive range.
5. Verify that the probe inputs are not connected to any signal.
6. Adjust OUTPUT ZERO on the board until the DMM reads 0 V ±100 μV. Refer to Figure 8
Adjustment Locations S/N 1000 and higher for adjustment location.
Figure 8 Adjustment Locations S/N 1000 and higher
Figure 9, Adjustment Locations S/N below 1000
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HFP2500 High Frequency Probe
Adjust Offset Range
Figure 10, Offset Range Adjustment Setup
1. Connect the BNC end of the BNC to mini-grabber cable to a female end of the BNC tee
adapter and a female BNC to dual banana plug adapter to the male end of the BNC tee.
2. Carefully insert Straight Tips (supplied in the accessory kit) into the HFP2500 probe head
sockets. Attach the red lead of the mini-grabber to the signal input and the black lead to the
ground input of the probe.
3. Set the power supply for approximately 0 Volt.
4. Plug the dual banana plug adapter, with the probe attached, into the output terminal of the
power supply. Make sure the side of the banana plug corresponding to the probe ground
and BNC ground is connected to the negative terminal of the power supply.
5. Attach a BNC cable to the unused female port of the BNC tee and a dual banana plug
adapter to the other end of the BNC cable and plug this into the DMM. Make sure the side
of the banana plug corresponding to the BNC shield (marked ’GROUND’) is connected to the
LO or COMMON input of the DMM. Refer to Figure 10, Offset Range Adjustment Setup for
setup information.
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6. Using the DMM to monitor the voltage, adjust the power supply to an output of 10.00 V ±10
mV. Record the reading.
7. Remove the banana plug adapter from the DMM connect the precision 50 Ω terminator into
the DMM Input. Make sure the side of the banana plug corresponding to the BNC shield
(marked ’GROUND’) is connected to the LO or COMMON input of the DMM.
8. Verify that the display for channel 1 is turned on. Set the oscilloscope OFFSET knob to –
10.00 V. as read on the oscilloscope screen.
9. Set the DMM to read DC Volt on the most sensitive range.
10. Subtract 10.0 V from the power supply output voltage recorded in step B-7. Be sure to keep
track of the sign of the result.
11. Adjust OFFSET RANGE until the DMM reads the same voltage ±1 mV as calculated in step B11. Be sure the sign agrees.
12. Repeat steps A-3 through A-7 of the Adjust Offset Zero procedure.
13. Disconnect the probe from the ProBus extender and re-install the circuit board into the
probe case, being careful to align the ProBus interface connector with the opening on the
other end of the case.
Verify Calibration
Repeat the Performance Verification procedure to ensure compliance with the warranted
specifications.
Apply a calibration sticker, if required, in accordance with your quality control procedures.
922253-00 Rev A
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HFP2500 High Frequency Probe
Reference
Certifications
This section contains the probe’s Electromagnetic Compatibility (EMC), Safety and Environmental
certifications.
EMC Compliance
EC DECLARATION OF CONFORMITY - EMC
The probe meets intent of EC Directive 2004/108/EC for Electromagnetic Compatibility. Compliance
was demonstrated to the following specifications as listed in the Official Journal of the European
Communities:
EN 61326-1:2006, EN 61326-2-1:2006 EMC requirements for electrical equipment for measurement,
control, and laboratory use.
Electromagnetic Emissions:
CISPR 11:2003, Radiated and Conducted Emissions Group 1, Class A 1 2
Electromagnetic Immunity:
EN 61000-4-2:2001 Electrostatic Discharge, 4 kV contact, 8 kV air, 4 kV vertical/horizontal coupling
planes 3
EN 61000-4-3:2006 RF Radiated Electromagnetic Field, 3 V/m, 80-1000 MHz; 3 V/m, 1400 MHz - 2
GHz; 1 V/m, 2 GHz - 2.7 GHz 3
1 Emissions which exceed the levels required by this standard may occur when the probe is connected to a
test object.
2 This product is intended for use in nonresidential areas only. Use in residential areas may cause
electromagnetic interference.
3 Meets Performance Criteria “B” limits of the respective standard: during the disturbance, product undergoes
a temporary degradation or loss of function or performance which is self-recoverable.
European Contact:
Teledyne LeCroy Europe GmbH
Waldhofer Str 104
D-69123 Heidelberg
Germany
Tel: (49) 6221 82700
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AUSTRALIA & NEW ZEALAND DECLARATION OF CONFORMITY—EMC
The probe complies with the EMC provision of the Radio Communications Act per the following
standards, in accordance with requirements imposed by Australian Communication and Media
Authority (ACMA):
CISPR 11:2003 Radiated and Conducted Emissions, Group 1, Class A, in accordance with EN613261:2006 and EN61326-2-1:2006.
Australia / New Zealand Contacts:
Vicom Australia Ltd.
1064 Centre Road
Oakleigh, South Victoria 3167
Australia
Vicom New Zealand Ltd.
60 Grafton Road
Auckland
New Zealand
Safety Compliance
EC DECLARATION OF CONFORMITY – LOW VOLTAGE
The probe meets intent of EC Directive 2006/95/EC for Product Safety. Compliance was
demonstrated to the following specifications as listed in the Official Journal of the European
Communities:
EN 61010-1:2010 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 1: General requirements
EN 61010-2:030:2010 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 2-030: Particular requirements for testing and measuring circuits
EN 61010-031/A1:2008 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 031: Safety requirements for hand-held probe assemblies for electrical
measurement and test.
Environmental Compliance
END-OF-LIFE HANDLING
The probe is marked with this symbol to indicate that it complies with the applicable
European Union requirements to Directives 2002/96/EC and 2006/66/EC on Waste
Electrical and Electronic Equipment (WEEE) and Batteries.
The probe is subject to disposal and recycling regulations that vary by country and
region. Many countries prohibit the disposal of waste electronic equipment in standard
waste receptacles. For more information about proper disposal and recycling of your
Teledyne LeCroy product, please visit teledynelecroy.com/recycle.
RESTRICTION OF HAZARDOUS SUBSTANCES (ROHS)
This probe has been classified as Industrial Monitoring and Control Equipment and is outside the
scope of the 2011/65/EU RoHS Directive until 22 July 2017 (per Article 4, Paragraph 3).
922253-00 Rev A
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HFP2500 High Frequency Probe
Contact Teledyne LeCroy
Teledyne LeCroy Service Centers
United States and Canada World Wide Corporate Office
Teledyne LeCroy Corporation
700 Chestnut Ridge Road
Chestnut Ridge, NY, 10977-6499, USA
Ph: 800-553-2769 / 845-425-2000
FAX: 845-578-5985
teledynelecroy.com
Support:
[email protected]
Sales:
[email protected]
United States - Protocol Solutions Group
Teledyne LeCroy Corporation
3385 Scott Boulevard
Santa Clara, CA, 95054, USA
FAX: 408-727-0800
teledynelecroy.com
Sales and Service:
Ph: 800-909-7211 / 408-727-6600
[email protected]
Support:
Ph: 800-909-7112 / 408-653-1260
[email protected]
European Headquarters
Teledyne LeCroy SA
4, Rue Moïse Marcinhes
Case postale 341
1217 Meyrin 1
Geneva, Switzerland
Ph: + 41 22 719 2228 / 2323 /2277
FAX:+41 22 719 2233
[email protected]
[email protected]
teledynelecroy.com/europe
Protocol Analyzers:
Ph: +44 12 765 03971
Singapore, Oscillosocpes
Teledyne LeCroy Singapore Pte Ltd.
Blk 750C Chai Chee Road #02-08
Technopark @ Chai Chee
Singapore 469003
Ph: ++ 65 64424880
FAX: ++ 65 64427811
Singapore, Protocol Analyzers
Genetron Singapore Pte Ltd.
37 Kallang Pudding Road, #08-08
Tong Lee Building Block B
Singapore 349315
Ph: ++ 65 9760-4682
China
Teledyne LeCroy Corporation Beijing
Rm. 2001 - Office; Rm. 2002 - Service Center
Unit A, Horizon Plaza
No. 6, Zhichun Road, Haidian District
Beijing 100088, China
Ph: ++86 10 8280 0318 / 0319 / 0320
FAX:++86 10 8280 0316
Service:
Rm. 2002
Ph: ++86 10 8280 0245
Korea
Teledyne LeCroy Korea
10th fl.Ildong Bldg.
968-5 Daechi-dong, Gangnam-gu
Seoul 135-280, Korea
Ph: ++ 82 2 3452 0400
FAX: ++ 82 2 3452 0490
Taiwan
LeColn Technology Co Ltd.
Far East Century Park, C3, 9F
No. 2, Chien-8th Road,
Chung-Ho Dist., New Taipei City, Taiwan
Ph: ++ 886 2 8226 1366
FAX: ++ 886 2 8226 1368
Japan
Teledyne LeCroy Japan
Hobunsya Funchu Bldg, 3F
3-11-5, Midori-cho, Fuchu-Shi
Tokyo 183-0006, Japan
Ph: ++ 81 4 2402 9400
FAX: ++ 81 4 2402 9586
teledynelecroy.com/japan
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Appendix A
Performance Verification Test Record
This record can be used to record the results of measurements made during the performance
verification of the HFP2500 High Frequency Probe.
Photocopy this page and record the results on the copy. File the completed record as required by
applicable internal quality procedures.
The section in the test record corresponds to the parameters tested in the performance verification
procedure. The numbers preceding the individual data records correspond to the steps in the
procedure that require the recording of data. Results to be recorded in the column labeled "Test
Result" are the actual specification limit check. The test limits are included in all of these steps.
Other measurements and the results of intermediate calculations that support the limit check are to
be recorded in the column labeled "Intermediate Results".
Permission is granted to reproduce these pages for the purpose of recording test results.
Probe Model: HFP2500
Serial Number:
Asset or Tracking Number:
Date:
Technician:
Equipment Used:
MODEL
SERIAL NUMBER
CALIBRATION DUE
DATE
OSCILLOSCOPE
DIGITAL MULTIMETER
FUNCTION GENERATOR
1
N/A
1The function generator used in this Performance Verification Procedure is used for making relative
measurements. The output of the generator is measured with a DMM or oscilloscope in this
procedure. Thus, the generator is not required to be calibrated.
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HFP2500 High Frequency Probe
HFP2500 TEST RECORD
Step
Description
Intermediate Data
Test Result
Output Zero Voltage
A-5
Output Zero Voltage (Test limit ≤± 800 μV)
__________ V
Offset Accuracy
B-7
Power Supply Negative Output Voltage
__________ V
B-10
Expected Negative Output Voltage
__________ V
B-14
Measured Negative Output Voltage
__________ V
B-16
Offset Error Voltage (Test limit ≤± 10.8 mV)
B-21
Power Supply Positive Output Voltage
__________ V
B-23
Expected Positive Output Voltage
__________ V
B-26
Measured Positive Output Voltage
__________ V
B-28
Offset Error Voltage (Test limit ≤± 10.8 mV)
_________mV
_________mV
LF Attenuation Accuracy
C-5
Generator Output Voltage
__________ V
C-6
Expected Output Voltage, top range
__________ V
C-8
Measured Output Voltage, top range
__________ V
C-10
Gain Error, top range (Test limit ≤± 1.0%)
C-15
Generator Output Voltage
__________ V
C-17
Expected Output Voltage, mid range
__________ V
C-19
Measured Output Voltage, mid range
__________ V
C-21
Gain Error, mid range (Test limit ≤± 1.0%)
40
__________%
__________%
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