K-SCAN MMDx K-CMM
K-SCAN MMDx
Handheld scanners
K-CMM
Optical trackers
Full freedom scanning in large volumes
NIKON METROLOGY I VISION BEYOND PRECISION
LARGE VOLUME, FULL FREEDOM 3D SCANNING
K-Scan MMDx is Nikon Metrology’s walk-around laser scanner for portable metrology
applications. Accuracy, ease-of-use and stunning performance ensure it to be the most capable
handheld scanning solution without mechanical constraints. The scanner is tracked by the
K-CMM Optical Tracker so that operators can measure anywhere needed
By combining the accuracy and productivity of the ModelMaker MMDx laser scanner with the
user freedom, measurement volume and motion compensation of the K-CMM Optical Tracker
system, the K-Scan MMDx becomes an invaluable tool for accurate part-to-CAD inspection and
productive reverse engineering
K-SCAN MMDx ADVANTAGES
• Fully portable scanning system that is easy to set up which is suited for both metrology lab and shop floor measurements
• Large system measurement volume of up to 35 m³, further expandable by leap frog functionalities, multi-camera support or dynamic referencing
• Maximum productivity is achieved by a scanning rate up to 150,000 points/second with a laser stripe width of up to 200 mm
• High-resolution data acquisition for both freeform surfaces and geometric features
• Excellent material scanning capabilities through use of Enhanced Sensor Performance (ESP3). Laser intensity of every point is instantly adapted
automatically to the material being measured. This capability allows different surface materials, finishes and transitions to be scanned without
user interaction, eliminating manual parameter tuning and part spraying altogether
• Lightweight and stable carbon fiber structure provides ergonomic features and visual/audio indicators for enhanced operator handling
• Continuous and precise omni-directional optical tracking via optimized LED configuration
• K-Scan MMDx is supported by the powerful and intuitive Focus Handheld & Inspection software suite
• Through the Nikon Metrology API, the K-Scan MMDx can be used directly in many 3rd party inspection and reverse engineering software
applications, including PolyWorks® and Geomagic®
K-CMM ADVANTAGES
DYNAMICALLY COMPENSATED
MEASUREMENT
MULTI-PROBING SOLUTION
By positioning LED markers on the
measured part, instabilities are
compensated so measurement
of parts that move or vibrate is
possible to the same level of
accuracy as if they were rigidly
fixtured
To measure geometric features, seamlessly switch to the
lightweight, highly repeatable Multi-Sided Probe which features
a range of motion free from directional limitations
Probe configurations can be quickly changed
using the integrated Renishaw Autojoint
adaptor to enable precise inspection of
visually or physically obstructed regions
At the same time it is possible to
simply move the camera to measure from a different
location using the LEDs to define a reference frame.
FULL FREEDOM OF MOVEMENT
WALK-AROUND INSPECTION
Mechanically unconstrained,
the K-CMM system can
measure large areas without
the need to move the camera
or the part
Combine several K7500 cameras
into the same co-ordinate
system using dynamic
targets to create a full
walk-around measurement cell
With a measurement depth of 6 m
even full cars, large press tools and heavy
machinery can be measured without repositioning
K-CMM is an accurate portable measurement system suitable for checking design, production and
dimensional quality in industrial environments. The system offers high measurement accuracy in a volume of
35 m³ up to 7.5 m distance from the camera by employing high-resolution optical technology to precisely
triangulate the locations of infrared LEDs mounted on the K-Scan MMDx scanner
Features / Key benefits
• Measure anywhere
• Effortless handling by ergonomic design
• High scanning throughput for maximum productivity
• Superior accuracy
• Flexibility
Applications
• Full freedom scanning of large objects: Automotive components of any size, complete vehicles
• Gap and flush analysis
• On-site measurement applications
• Part-to-CAD inspection
• Scanning for reverse engineering
SPECIFICATIONS
K-Scan MMDx100
K-Scan MMDx200
10 µm
100 mm
100 mm
85 mm
65 µm
50 Hz
16 µm
200 mm
150 mm
95 mm
115 µm
60 Hz
Accuracy (1σ)
Stripe width
Measuring range
Stand-off
Min. point resolution
Full FoV frame rate
Max. frame rate
Max. points per stripe
Laser power adjustment
Warm up time
Laser power
Field of View indicator
Weight
Dimensions
1,2
1
Typical values are 30% better than published values.
2
Laser scanner Accuracy is determined by scanning a plane from various
directions, each time using the entire scanner field of view. The result is the
maximum 1σ deviation of the scan data to fitted plane features.
150 Hz
1000
ESP3 real-time per point
0s
Class 2, 660 nm
Dot
1200 g
250 mm x 220 mm x 210 mm
Complies with 21 CFR 1040.10
and 1040.11, Laser Notice No.
50 dated June 24, 2007
LASER RADIATION
DO NOT STARE INTO BEAM
CLASS 2 LASER PRODUCT
Max output = 5 mW & 1.0 mW
Emitted wavelength:
660 nm & 635 nm
IEC60825-1 edition 2.0 2007-03
CLASS 2 Laser Product
Read manual before use
K-CMM specifications
K-CMM K7500
Depth of Field
Max. Field of View
Volume
Volumetric accuracy 3
Single point accuracy 4
Single point repeatability5
Weight
Dimensions
Temperature
Humidity
Warm up time
Power
Volume indicator laser
6.0 m
3.7 m x 2.7 m
35 m3
Zone 1 (1.5 m to 3.0 m from camera)
70 µm + 25 µm/m
Zone 2 (3.0 m to 4.5 m from camera)
80 µm + 25 µm/m
Zone 3 (4.5 m to 6.0 m from camera)
95 µm + 25 µm/m
Zone 4 (6.0 m to 7.5 m from camera)
170 µm + 25 µm/m
Up to 20 µm RMS
Up to 20 µm RMS
24 kg
1157 mm x 230 mm x 175 mm
Operating: 10 °C to 35 °C
(Storage: -10 °C to 50 °C)
Operating: 30% to 70%
(Storage: 10% to 90%, non-condensing)
30 to 60 minutes
100/240 VAC, 50/60 Hz, 1.0 A
Class 2M, 635 nm
3
Volumetric accuracy is certified in accordance with
procedures derived from the general guidelines of ISO
10360-2:2013 for size measurements. Certification
consists of performing comparisons of measured values to traceable length artefacts in various different locations and/or orientations in the field of view of the
Optical Tracker using the MSP with standard probe stylus. The indicated specification represents a 95% confidence interval.
4
Single point accuracy is calculated by measuring the MSP with standard probe stylus in a static position for one second. The RMS error of the collected
points is reported.
5
Single point repeatability is calculated by placing
the standard probe stylus with MSP in a conical socket and measurements taken from various angles. The
RMS error of the collected points is reported.
All weights and dimensions are approximate.
LASER RADIATION
DO NOT STARE INTO BEAM
OR VIEW DIRECTLY WITH
OPTICAL INSTRUMENTS
CLASS 2 LASER PRODUCT
max output 1mW CW, wavelength
635 nm IEC/EN 60825-1: 2007
Complies with 21 CFR1040.10 and 1040.11 except for deviations
pursuant to Laser Notice No. 50, dated June 24, 2007
NIKON METROLOGY NV
NIKON CORPORATION
Geldenaaksebaan 329
B-3001 Leuven, Belgium
phone: +32 16 74 01 00 fax: +32 16 74 01 03
[email protected]
Shinagawa Intercity Tower C, 2-15-3, Konan,
Minato-ku, Tokyo 108-6290 Japan
Telefon: +81-3-6433-3701 Fax: +81-3-6433-3784
www.nikon.com/products/industrial-metrology/
NIKON METROLOGY EUROPE NV
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[email protected]
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K-Scan_EN_0517 – Copyright Nikon Metrology NV 2017. All rights reserved. The materials presented here aresummary in nature, subject to change and intended for general information only.
K-Scan MMDx specifications
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