Passive Component Test Solution
Passive Component Test Solution
Selection Guides
12-1
LCR Meter/Automatic Transformer Test System
12-3
Electrolytic Capacitor Analyzer
12-15
Programmable HF AC Tester
12-19
Milliohm Meter
12-21
Component Test Scanner
12-22
Automatic Test System
12-23
Options of Passive Component Test Instruments
12-35
Overview
Capacitor
Test System
Bias Current
Test System
Component
ATS
EDLC ATS
EDLC LC
Monitoring
System
Magnetic
Component
Test System
Inductor Test &
Packing Machine
Inductor Layer Short ATS
Milliohm Meter
Capacitor Leakage Current/IR Meter
Electrolytic Capacitor Analyzer
HF LCR Meter
Automatic Transformer Tester
LCR Meter
Programmable HF AC Tester
Automatic Component Analyzer
Bias Current Source
Component Test Scanner
Selection Guides
LCR Meter Selection Guide
Model
Frequency Range
100Hz, 120Hz, 1kHz
11020
100Hz, 120Hz, 1kHz, 10kHz
11021
1kHz, 10kHz, 40kHz, 50kHz
11021-L
11022
50/60/100/120/1k/10k/
20k/40k/50k/100k Hz
11050-30M (New)
11050 (New)
11050-5M (New)
50/60/100/120/1k/10k/
20k/40k/50k/100k Hz
75kHz~30MHz
1KHz~10MHz
60Hz~5MHz
1062A
11025
Impedance Range
0.1pF ~ 4.00 F
0.1mΩ ~ 100MΩ
0.1mΩ ~ 100MΩ
Description
High speed capacitance inspection
Digital bin-sorting and comparator functions, up to 1kHz only optional
Digital bin-sorting and comparator functions
Digital high speed measurement in all test frequencies,
excellent low-impedance measurement accuracy,
bin-sorting and comparator functions
Page
12-7
12-4
12-4
0.01mΩ ~ 100MΩ
Identical Model 11022, and add transformer testing function
12-5
0.1mΩ ~ 100MΩ
0.1mΩ ~ 100MΩ
0.1mΩ ~ 100MΩ
wide range test frequency, high speed measurement, and excellent accuracy
wide range test frequency, high speed measurement, and excellent accuracy
wide range test frequency, high speed measurement, and excellent accuracy
12-3
12-3
12-3
0.01mΩ ~ 100MΩ
12-5
40Hz~200kHz, 30 points
0.01mΩ ~ 100MΩ
Excellent low impedance measurement accuracy and comparator function
12-6
1075
20Hz~200kHz
0.01mΩ ~ 100MΩ
12-6
3252
20Hz~200kHz
0.1mΩ ~ 100MΩ
3302
20Hz~1MHz
0.1mΩ ~ 100MΩ
Excellent low impedance measurement accuracy and bin-sorting function
LCR + transformer testing and frequency characteristics analysis function
Built-in 1A/8mA bias current source optional
Identical Model 3252 1MHz edition
Auto Transformer Test System Selection Guide
Model
Frequency Range
Impedance Range
13350 + A133502
20Hz ~ 200kHz
0.1mΩ ~ 100MΩ
13350 + A133505
20Hz ~ 200kHz
0.1mΩ ~ 100MΩ
3250 + A132501
20Hz ~ 200kHz
0.1mΩ ~ 100MΩ
3252 + A132501
3302 + A132501
3312 + A132501
20Hz ~ 200kHz
20Hz ~ 1MHz
20Hz ~ 1MHz
0.1mΩ ~ 100MΩ
0.1mΩ ~ 100MΩ
0.1mΩ ~ 100MΩ
Bias Current Source / Test System Selection Guide
Model
Frequency Range
Impedance Range
20Hz ~ 200kHz
0~10A
1310
1320
20Hz ~ 1MHz
0~20A
1320S
20Hz ~ 1MHz
0~20A
1320-10A
20Hz ~ 1MHz
0~10A
11300
20Hz~1MHz
0~300A
Electrolytic Capacitor Tester Selection Guide
Model
Primary Function
11800
11801
11810
11200
13100
Ripple current tester
Description
High speed 20 channels/Transformer L/C/Z/DCR/Turns-ratio/
Pin-short/Balance scanning test function
High speed 80 channels/Transformer L/C/Z/DCR/Turns-ratio/
Pin-short/Balance scanning test function
20 channels/Transformer L/C/Z/DCR/Turns-ratio/
Pin-short/Balance scanning test function
Identical Model 3250 and add LCR Meter function
Identical Model 3252 1MHz edition
Identical Model 3302 and add Telecom parameter measurement function
Description
Economic type
Programmable, and also can be controlled by Chroma 3252/3302
combined with Chroma 1320 to extend drive current
Slave (1320)
Identical 1320 10A edition, mainly used in PFC choke testing which higher
DC resistance and the DC voltage dropped exceeds 6V
Intergration of 1320S with LCR Meter for large bias current testing
of power choke
12-10
12-10
Page
12-8
12-8
12-10
12-10
12-10
12-12
Page
12-13
12-13
12-13
12-13
12-14
Test Signal
Description
Page
100Hz/120Hz/400Hz/1kHz,
0~30A DC Bias 0.5V~500V
For load life testing of electrolytic capacitor
which used in power line rectifier
12-17
20k~100kHz, 0~10A,
DC Bias 0~500V
20k~1000kHz, 0~10A,
Ripple current tester
DC Bias 0~500V
Capacitor leakage current /
1.0~650V/800V,
IR meter
CC 0.5~500mA
Electrolytic capacitor
AC 100Hz/120Hz/1KHz/10kHz/
analyzer
20kHz/50kHz/100kHz, 1V/0.25V
Ripple current tester
For load life testing of electrolytic capacitor
which used in SMPS output filter
For load life testing of high frequency MLCC, OS-CON,
polymer capacitor that used by DC to DC converter
For electrolytic capacitor leakage current and
aluminum-foil W.V. testing
For high and low frequency electrolytic capacitor I.Q.C.,F.Q.C.
multi-parameter scanning testing (C/D/Z/ESR/LC)
12-17
12-17
12-18
12-15
Component Test Scanner Selection Guide
Model
13001
12-1
Primary Function
Scanner
Option
Description
Page
A130007 40 channels
scan module
For RJ-45 equipment, glass substrate, LCD glass substrate,
printed circuit glass, PCB, EMI filter, ICT application.
It could combined with Chroma 8800 Component ATE
for process control and data collection
12-22
All specifications are subject to change without notice.
Milliohm Meter Selection Guide
Model
Primary Function
Test Range
DC, Pulsed
16502
HF AC Tester Selection Guide
Primary
Model
Function
HF, HV, CV
HF, HV, CV
11802
HF, HI, CC,
Bias voltage
HF, CV,
Bias current
Temperature
meter
HF, HV, CV
(or + DC source)
11803
HF, CV,
Bias current
Temperature
meter
11805
HF, HI,
Bias voltage
HF, HV
Description
Digital milliohm meter with bin-sorting, comparator
function, reduce thermal EMF affection
0.001mΩ~2MΩ
Option
Application Description
A118031 HF HV 5kV/100mA max
A118014 HF HV 2.5kV/200mA max
A118017 HF HV 8kV/100kHz max
LCD inverter transformer (ceramic capacitor, cable,
PCB) load life / withstanding voltage / breakdown voltage test
EEFl, backlight load life / lamp current test
SMPS main transformer and active PFC choke load life test
and electrical analysis
Medical equipment high frequency leakage current
safety inspection
Automobile motor corona discharge inspection, analysis
and production line
Step-up current test module +
specified resonant inductor/ capacitor
Ripple Voltage Test Module
Chroma 11200 CLC / IR Meter
(for DC voltage source with discharge function)
Step-up current test module
+ AC/DC coupling test fixture
Chroma DC power supply (for DC bias current)
Chroma 12061 Digital Multimeter
(for temperature measurement)
HF HV test module
Option Chroma DC source*3
Step-up current test module
+ AC/DC coupling test fixture
Chroma DC power supply (for DC bias current)
Chroma 12061 Digital Multimeter
(for temperature measurement)
Ballast capacitor / inductor ignition voltage load life test
DC-DC converter SMD power choke temperature rising test
(DC Bias current with AC ripple voltage) and electrical analysis
High voltage capacitor load life test
LCD inverter transformer( ceramic capacitor, cable, PCB)
withstanding voltage test for production line
Medical equipment high frequency
leakage current safety inspection
Automobile motor corona discharge inspection
for production line
Passive Component
(inverter transformer, ceramic capacitor, cable, PCB etc.)
High Frequency and High Voltage Load Life Test
11891
HF, HV, CV
A118031 HF HV 5kV/100mA max
A118014 HF HV 2.5kV/200mA max
12-19
Function as HF HV AC +DC power source
for FFl and SED device analysis
A118018 HF, HV 1kV/1A max.
A118031 HF HV 5kV/100mA max
A118014 HF HV 2.5kV/200mA max
Page
DC-DC converter SMD power choke temperature rising test
(DC Bias current with AC ripple voltage) and electrical analysis
Snubber capacitor load life test
HF, HV, CV
12-21
Snubber capacitor load life test
A118015 HF, HI 33V/30A max.
11890
Page
12-19
12-19
12-19
12-19
Automatic Test System Selection Guide
Model
Primary Function
Test Signal
Description
Page
1810
Magnetic Component
Test System
DC Bias Current 60A max.
HF AC Voltage 20kHZ~1MHZ
Power choke, Low Inductance Inductor
12-23
1820 (New)
Capacitor Test System
DC Bias Voltage 3kV max.
HF AC Current 10kHz~200kHz
Film Capacitor
12-24
Testing and packing for Chip inductor
12-25
5 tests simultaneously /2 test simultaneously
Layer short testing and sorting for Chip inductor
12-26
12-27
Polarity test/Layer short test/BIAS current test/
1870D (New)
Inductor Test & Packing Machine
Hipot test/ DCR test/LsQ test
1870D-12 (New)
1871 (New)
Inductor Layer Short ATS
8800
Component ATS
L/C/R/Z/DCR/Turns-ratio/
Insulation Resistance (IR)
For RJ-45 equipment
(including LAN Modules, Ethernet IC, PoE IC, etc.),
glass substrate, LCD glass substrate,
printed circuit glass (including touch panel, etc),
PCB, EMI filter and ICT applications
8801
EDLC ATS
C (DC), internal resistance (DC), ESR (AC)
For Electrical Double Layer Capacitor on
production lines
12-29
8802
EDLC LC Monitoring System
Leakage Current (LC)
For Electrical Double Layer Capacitor on
production lines
12-31
All specifications are subject to change without notice.
12-2
HF LCR Meter
KEY FEATURES
■ Test Parameter : L/C/R/Z/Y/DCR/Q/D/ θ
■ Test Frequency :
75kHz ~ 30MHz (11050-30M)
1kHz ~ 10MHz (11050)
60Hz ~ 5MHz (11050-5M)
■ Test Level : 10mV ~ 5V
■ Basic Accuracy : 0.1%
■ 7ms fast speed measurement
■ 3 kinds of output impedance modes
■ Test signal monitoring function
■ Compare & bin-sorting function
■ Open/short zeroing & load correction function
■ Detached measurement & display unit design
■ Standard Handler, RS-232C, USB storage &
external bias current control interface
■ Optional GPIB or LAN interface
The Chroma 11050 series HF LCR Meter is a
precision test instrument featured in measuring
and evaluating the passive components with
accuracy and fast speed. The measured items
cover the primary and secondary parameters
required for testing the inductance, capacitance,
resistance, quality factor and loss factor of
passive components. The HF LCR Meter has a
broad testing frequency range 75kHz~30MHz/1
kHz~10MHz/60Hz~5MHz suitable for analyzing
component characteristics under different
frequencies. Its 0.1% basic measurement accuracy
not only makes the measured results show high
stability but also high reliability. The fast 15ms
measurement speed can effectively increase the
productivity when working with the automated
machines.
In addition to the excellent measurement features
of other Chroma LCR Meters, the 11050 series
also has a variety of convenient functions. It has
3 kinds of output impedance modes to satisfy
the demands of measuring and working with
other instruments. The flexible digital display
allows adjustments to its best fit based on the
testing resolution while the test signal monitoring
function is able to view the voltage and current
actually carried on the DUT. Also the timing
settings of trigger delay, measure delay and
average number of times allow the measurements
to work closely with the automated machines to
get the most accurate results within the limited
testing time.
The detached design adopted by Chroma 11050
series uses dual CPU to process the testing and
display. It not only increases the testing speed but
also shortens the test leads' length when applying
to the automated machines in improving the
accuracy of high frequency measurement.
12-3
Model 11050 Series
Another feature of Chroma 11050 series is
complete interface configuration. The standard
inter faces include Handler and RS-232C for
hardware and software to set the test conditions,
trigger measurement, judge test results and
collect measured data. The USB interface is able
to save the device settings and control the output
of DC bias current source. GPIB and LAN are
optional interfaces available for purchase as per
user's demand for software communication.
Owing to the design of portable electronic
communication products nowadays tends to
be thin with low power consumption, the test
frequency of power inductors is getting higher
and that makes the equivalent series resistance of
component become a critical indicator to identify
good or bad products. The buffer capacitor plays
an important role for overall circuit reliability
and in order to work normally under high
voltage transient environment, the equivalent
series resistance has to remain at a very low
level during high frequency. The Chroma 11050
series is focused on testing passive components
under high frequency during development so
that it is close to the user's actual requirements
with enhanced key measurement functions.
SPECIFICATIONS
Model
Test Parameter
Test Signal
11050-30M
The accuracy enhancement of low impedance
measurements strengthens the usability of
Chroma 11050 series in high frequency testing
applications.
Designed with extensive considerations and
enhancements of key features, Chroma 11050
series HF LCR Meter is the best selection for
product characteristics analysis, fast testing in
automated production line or parts incoming/
outgoing management.
ORDERING INFORMATION
11050 : HF LCR Meter 1kHz~10MHz
11050-30M : HF LCR Meter 75kHz~30MHz
11050-5M : HF LCR Meter 60Hz~5MHz
A110211 : Test fixture (DIP)
A110234 : Test leads (1M)
A110501 : : 4-Terminal SMD test fixture
A133509 : GPIB & Handler interface
A133510 : LAN & USB-H interface
B110500 : Extension test lead for automation
(BNC to SMA, 1M)
11050
L, C, R, Z, Y, DCR, Q, D, θ
11050-5M
75kHz ~ 30MHz
1kHz ~ 10MHz
60Hz ~ 5MHz
± (0.1% + 0.01Hz)
± (0.1% + 0.01Hz)
± (0.1% + 0.01Hz)
10mV ~ 1V ;
≦1MHz: 10mV ~ 5V; ± [(10 + fm)% + 10mV]
Test Level
>1MHz: 10mV ~ 1V; ± [(10 + fm)% + 1mV]
± [(10 + fm)% + 10mV]
fm: test frequency [MHz]
fm: test frequency [MHz]
Output Impedance
100Ω, 25Ω
100Ω, 25Ω, OFF
Measurement Display Range
L
0.00001uH ~ 99.999MH
C
0.00001pF ~ 999.999F
R, Z
0.01mΩ ~ 9999.99MΩ
DCR
0.01mΩ ~ 999.99MΩ
Q, D
0.00001 ~ 99999
-90.00˚ ~ 90.00˚
θ
Basic Accuracy
Z
± 1.5%
± 0.1%
θ
± 0.3%
± 0.04˚
DCR
± 0.1%
Very Fast : 7ms, Fast : 15ms, Medium : 150ms, Slow : 295ms (1kHz)
Measurement Speed
RS-232C, Handler, USB storage, External bias current control,
Communication
GPIB (option), LAN (option)
Interface
Measurement Functions
Trigger Mode
Internal, Manual, External, Bus
Range Switching Mode
Auto, Hold
Equivalent Circuit Mode
Series, Parallel
Judgment
Compare, Bin-sorting
Correction
Open/Short Zeroing, Load Correction
Others
Operating Environment
Temperature : 0℃ ~ 40℃ ; Humidity : 10% ~ 90%
Power Consumption
60VA max.
Power Requirement
100 ~ 240V ±10% , 47Hz ~ 63Hz
Dimension (H x W x D)
230 x 428 x 290 mm / 9.06 x 16.85 x 11.42 inch
Weight
Approx. 8 kg / 17.64 lb
Test Frequency
All specifications are subject to change without notice.
LCR Meter
Model 11021/11021-L
Video &
Color
Flat Panel
LED/
Display Lighting
ORDERING INFORMATION
Primary Parameter
Secondary Parameter
Basic Accuracy *1
Measurement Time (1KHz) *22)
Fast
L, C, R, |Z|
Q, D, ESR, Xs, θ
0.25V / 1V , ±(10% + 3 mV)
50mV/ 1V, ±10%+3mV
100Hz, 120Hz, 1kHz, 10kHz
1kHz, 10kHz, 40kHz, 50kHz
(9.6kHz)
±0.25%
±0.02%
Varies as range resistors 25, 100, 1k, 10k, 100k
L: 0.01µH ~ 9.999kH, C: 0.01pF ~ 99.99mF,
R,lZl: 0.1m. ~ 99.99MΩ
Q: 0.1 ~ 9999.9, D: 0.0001 ~ 9999.9, θ: -180.00˚~ +180.00˚
±0.1%
±0.2%
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
12-4
PXI Test &
Measurement
All specifications are subject to change without notice.
Semiconductor/
IC
Medium
Slow
Trigger
Display
L, C, R, |Z|, Q, D, R, θ
40 x 4 (Character Module) LCD Display
Function
Correction
Open/Short zeroing
Equivalent Circuit Mode
Series, Parallel
Interface & Input/Output
Interface
RS-232 (Standard), Handler & GPIB (Optional)
Output Signal
Bin-sorting & HI/GO/LOW judge
Comparator
Upper/Lower limits in value
Bin Sorting
8 bin limits in %
Trigger Delay
0 ~ 9999mS
General
Operation Environment
Temperature : 10˚C ~ 40˚C, Humidity < 90 % R.H.
Power Consumption
50VA max.
Power Requirement
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
Dimension (H x W x D)
100 x 320 x 206.4 mm / 3.94 x 12.6 x 8.13 inch
Weight
4 kg / 8.81 lbs
Note*1 : 23±5˚C after OPEN and SHORT correction, slow measurement speed. Refer to operation
manual for detail measurement accuracy descriptions.
Note*2 : Measurement time includes sampling, calculation and judge test parameter measurement.
Note*3 : Freq.=1kHz/10kHz 145ms Freq.=40kHz 185ms Freq.=50kHz 150ms
Note*4 : Freq.=1kHz/10kHz 325ms Freq.=40kHz 415ms Freq.=50kHz 400ms
Electrical
Safety
Freq = 1kHz/10kHz : 75ms
Freq = 40kHz : 105ms
Freq = 50kHz : 90ms
*3
145ms
*4
325ms
Internal, Manual, External, BUS
Freq = 1k/10kHz : 75ms
Freq = 100/120Hz: 85ms
Power
Battery Test &
Passive
Electronics Automation Component
The 11021-L is the ideal selection for high
frequency coil, core, choke, and etc. passive
components incoming/outgoing material quality
inspect and automatic production.
Frequency Accuracy
Output Impedance (Typical)
Measurement Display Range
11021-L
Automated
Optical Inspection
The Chroma 11021/11021-L use lower harmonicdistortion phase-detection technology to reduce
affection of measurement accuracy caused by
hysteresis distortion in magnetic component or
high dielectric-coefficient capacitor measurement,
which is not provided in general low-end LCR
Meters.
Test Frequency
11021
Photovoltaic Test
& Automation
The Chroma 11021/11021-L LCR Meter are the
most cost-effective digital LCR Meter, provides
100Hz, 120Hz, 1kHz, and 10kHz test frequencies
for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test
frequencies for the 11021-L. Standard RS-232
interface, optional GPIB & Handler interface,
high speed and stable measurement capabilities
enable the Chroma 11021/11021-L can be used
for both component evaluation on the production
line and fundamental impedance testing for
bench-top applications.
SPECIFICATIONS
Model
Measurement Parameter
Primary Display
Secondary Display
Test Signals Information
Test Level
Optical
Devices
KEY FEATURES
■ Test frequencies:
100Hz, 120Hz, 1kHz and 10kHz (9.6kHz) (11021)
1kHz, 10kHz, 40kHz, 50kHz (11021-L)
■ Basic accuracy: 0.1% (11021), 0.2% (11021-L)
■ 0.1mΩ~99.99 MΩ measurement range, 4 1/2
digits resolution
■ Lower harmonic-distortion affection
■ Fast measurement speed (75ms)
■ Standard RS-232 interface
■ Optional GPIB & Handler interface
■ Programmable trigger delay time is convenient
for measurement timing adjustment in
automatic production
■ Bin-sorting function
■ Comparator and pass/fail alarming beeper
function
■ Text mode 40x4 matrixes LCD display
■ Friendly user interface
■ Open/short zeroing
■ On-line fireware refreshable (via RS-232)
■ Input protection (1 Joule)
11021 : LCR Meter 1kHz
11021 : LCR Meter 10kHz
11021-L : LCR Meter
A110104 : SMD Test Cable #17
A110211 : Component Test Fixture
A110212 : Component Remote Test Fixture
A110232 : 4 BNC Test Cable with Clip#18
A110234 : High Frequency Test Cable
A110235 : GPIB & Handler Interface
A110236 : 19" Rack Mounting Kit
A110242 : Battery ESR Test Kit
A133004 : SMD Test Box
A165009 : 4 BNC Test Cable with Probe
LCR Meter
Model 11022/11025
ORDERING INFORMATION
KEY FEATURES
■ 0.1% basic accuracy
■ Transformer test parameters (11025),
Turns Ratio, DCR, Mutual Inductance
■ 50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz,
20kHz, 40kHz, 50kHz, 100kHz test frequencies
■ 21ms measurement time (≧100Hz)
■ Agilent 4263B LCR Meter commands
compatible
■ 4 different output resistance modes selectable
for non-linear inductor and capacitor
measuring
■ High resolution in low impedance(0.01mΩ)
and high accuracy 0.3% till 100mΩ range
■ Adjustable DC bias current up to 200mA
(constant 25Ω) (11025)
■ 1320 Bias Current Source directly control
capability
■ 0.01mΩ ~ 99.99MΩ wide measurement range
(4 1/2 digits)
■ Dual frequency function for automatic
production
■ BIAS comparator function
■ Comparator function and 8/99 bin-sorting
function
■ Pass/fail judge result for automatic production
■ Handler interface trigger edge (rising/falling)
programmable
■ Test signal level monitor function
■ Standard GPIB, RS-232, and handler interface
■ Open/short zeroing, load correction
■ LabView® Driver
Th e C h ro m a 11022 a n d 11025 LC R M e te r s
are the measurement instruments for passive
components. They are applicable to the automatic
manufacturers for passive components in material
inspection. With the features of 21ms high-speed
measurement and 0.1% accuracy, 11022 LCR
Meter fulfills the requirements for fast production.
Its functions of 8-level counting, 8/99 Bin-sorting,
pass/fail judgment, and 50 sets of internal save
and recall settings totally meet the production line
requirements for easy operation.
The four impedance output modes can measure
the results with the LCR Meters of other brands to
get a common measurement standard. Chroma
11025 LCR Meter is compatible with HP 4263B
LCR Meter IEEE-488.2 control interface and has
three impedance output modes for selection. The
measurement results can also be compared with
other brand of LCR Meters. Chroma11022/11025 is
the ideal selection for passive components quality
assurance and automatic production.
11022 : LCR Meter
11025 : LCR Meter
A110104 : SMD Test Cable #17
A110211 : Component Test Fixture
A110212 : Component Remote Test Fixture
A110232 : 4 BNC Test Cable with Clip#18
A110234 : High Frequency Test Cable
A110236 : 19" Rack Mounting Kit
A110239 : 4 Terminals SMD Electrical Capacitor
Test Box (Patent)
SPECIFICATIONS
Model
Test Parameter
Test Signals
Level
Frequency
Output Impedance
(Nominal Value)
DC Bias Current
(Freq. ≧ 1kHz)
Measurement Display Range
C (Capacitance)
L, M, L2 (Inductance)
Z (Impedance), ESR
Q (Quality Factor)
D (Dissipation Factor)
θ(Phase Angle)
Turns Ratio (Np:Ns)
DCR
Basic Measurement Accuracy *1
Measurement Time (Fast) *2
Interface & I/O
Interface
Output Signal
Comparator
Bin Sorting
Trigger Delay
Display
Function
Correction
Averaging
Cable Length
Test Sig. Level Monitor
Equivalent Circuit mode
Memory (Store/ Recall)
Trigger
General
Operation Environment
Power Consumption
Power Requirements
Dimension (H x W x D)
Weight
A110242 : Battery ESR Test Kit
A110244 : High Capacitance Capacitor Test Fixture
A110245 : Ring Core Test Fixture
A113012 : Vacuum Generator for A132574
A113014 : Vacuum Pump for A132574
A132574 : Test Fixture for SMD power choke
A133004 : SMD Test Box
A133019 : BNC Test Lead, 2M (single side open)
A165009 : 4 BNC Test Cable with Probe
11022
L,C, R,|Z|, Q, D, ESR, X,θ
11025
L,C, R,|Z|, Q, D, ESR, X,θ
DCR4, M, Turns Ratio, L2, DCR2
10 mV~1V , step 10 mV; ±(10% + 3 mV)
50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz,
100kHz ; ±0.01%
Constant 107 x : 25Ω ; Constant 320 x : 100Ω
Constant 106x: 2Ω,for Z≧10Ω,
100mA (1V setting) for reactive load≦10Ω
Constant 102x: 25Ω, for Z<1Ω, 100Ω for else
50mA max. for Constant 100Ω
-200mA max for Constant 25Ω
(AC level ≦ 100mV)
0.001pF ~ 1.9999F
0.001µH ~ 99.99k
0.01mΩ ~99.99MΩ
0.0001 ~ 9999
-180.00˚ ~ +180.00˚
---
0.9~999.99
0.01mΩ~99.99MΩ
±0.1%
21ms
handler (50pin), GPIB, RS-232
Bin-sorting & HI/GO/LOW judge
Upper/Lower limits in value
8/99 bin limits in %, ABS
0~9999ms
240 x 64 dot-matrix LCD display
Open/ Short zeroing, load correction
1~256 programmable
0m, 1m, 2m, 4m
Voltage, Current
Series, Parallel
50 instrument setups
Internal, Manual, External, BUS
Temperature : 10˚C~40˚C Humidity : < 90 % R.H.
65VA max
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
100 x 320 x 347.25 mm / 3.94 x 12.6 x 13.67 inch
5.5 kg / 12.11 lbs
Note*1 : 23 ± 5˚C after OPEN and SHORT correction. Slow measurement speed. Refer to Operation
Manual for detail measurement accuracy descriptions.
Note*2 : Measurement time includes sampling, calculation and judge of primary and secondary test
parameter measurement.
12-5
All specifications are subject to change without notice.
Precision LCR Meter
Model 1062A/1075
L,C,R, Z,Δ%
L, C, R, ZΔ, Δ%
Q, D, ESR,θ
10mV~2.5V(non-106x mode),10mV/step
40 Hz~200 kHz, 30 steps
20 Hz~200 kHz, programmable
±0.01%
Constant = 0 : Varies as range resistors; Constant = 1 : 25Ω±5%
Constant = 2 : 100Ω±5% ; Constant = 3 : 2Ω, for impedance≧10Ω ;
100mA (1V setting), for inductive load ≦ 10Ω
R, |Z| : 0. 01mΩ~9999.9MΩ, L: 0.0001µH~9999.9H, C: 0.0001pF~9999.9mF
Q,D: 0.0001~9999, θ: -90.00˚~+90.00˚,
ESR: 0.01mΩ~9999kΩ, Δ% : 0.0001%~999.99%
±0.1%
Semiconductor/
IC
55 ms
115 ms
130 ms
Internal, External, Manual
L, C, R, |Z| : 5 digits
Q, D, R, θ : 4 digits
Freq./Voltage/Current : 3 digits
D/Q Limit : 5 digits
L, C, R, |Z| : 5 digits
Q, D, R, θ : 4 digits
Freq./Voltage/Current : 3 digits
Bin No./Range : 1 digits
PXI Test &
Measurement
Display
1075
Electrical
Safety
Basic Accuracy *1
Measurement Time (Fast) *2
Frequency≧1kHz
Frequency =120Hz
Frequency =100Hz
Trigger
Model 1075
Power
Battery Test &
Passive
Electronics Automation Component
Secondary Parameter
Automated
Optical Inspection
Measurement Display Range
Primary Parameter
1062A
Photovoltaic Test
& Automation
Output Impedance(Typical)
The 1062A/1075 LCR Meters are the measurement
instruments for passive components. They are
applicable to the automatic manufacturers for
passive components in material inspection and
production line. This series of LCR Meters can
fully fulfill the fast and accurate requirements
for automatic production. The functions of
8-level counting, pass/fail judgment, and 10
sets of internal save and recall settings meet
the production line requirements for speed and
quality, thus make this series of LCR Metes the
best measurement instruments for material
and production line inspection for passive
components.
12-6
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Function
Correction
Open/Short Zeroing
Open/Short zeroing, Load
Equivalent Circuit Mode
Series, Parallel
Interface & Input/Output
Interface
GPIB, Handler (24 pin)
GPIB ,Handler (24 pin)
Output Signal
Pass/Fail identification
Sorting Signal
Comparator
Upper limit/ Lower limit(%) setting
-Bin Sorting
-8 bin sorting (%)
Memory
1 set
10 set
General
Operation Environment
Temperature : 10˚C ~ 40˚C, Humidity : < 90 % R.H.
Power Consumption
55VA max.
Power Requirement
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
Dimension (H x W x D)
130 x 410 x 353 mm / 5.12 x 16.14 x 13.9 inch
Weight : The specification of accuracy is under the following conditions:
6.2 kg / 13.66 lbs
Note*1
1) Warm up time: >10 min. 2) Environment temperature : 23±5˚C 3) OPEN/SHORT offset modification completed 4) D < 0.1
Note*2 : Measurement time includes all of the time for UUT measurement, calculation and primary/secondary parameters identification.
All specifications are subject to change without notice.
Optical
Devices
SPECIFICATIONS
Model
Measurement Parameter
Primary Display
Secondary Display
Test Signals Information
Test Level
Test Frequency
Frequency Accuracy
1062A : Precision LCR Meter
1075 : LCR Meter
A110104 : SMD Test Cable #17
A110211 : Component Test Fixture
A110212 : Component Remote Test Fixture
A110232 : 4 BNC Test Cable with Clip#18
A110234 : High Frequency Test Cable
A110239 : 4 Terminals SMD Electrical Capacitor
Test Box (Patent)
A110601 : GPIB & handler Interface
A133004 : SMD Test Box
A165009 : 4 BNC Test Cable with Probe
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ Test frequency : 20Hz ~ 200kHz, 0.2%
programmable test frequency (1075)
■ Test frequency : 40Hz ~ 200kHz, 30 Steps
(1062A)
■ Basic accuracy : 0.1%
■ 3 different output impedance modes,
measurement results are compatible with other
well-know LCR meters
■ High resolution (0.01mΩ) and high accuracy
0.3% till 400mΩ range are the right tool for
low inductance
■ Large capacitance, and low impedance
component measuring
■ Single-function keys, clear LED display, easy to
operate
■ 0.01mΩ~99.999mΩ wide measurement
range with 5 digits resolution
■ Optional Handler & GPIB interface
■ 8 bin sorting and bin sum count function
(1075)
■ Primary parameter: HI/GO/LO and secondary
parameter: GO/NG judge result (1062A)
■ Alarm for GO/NG judge result
■ L/C/R/Z nominal value, upper limit %, lower
limit %, Q/D/R/θ limit setting display (1062A)
■ 10 bins sorting and bin sum count function
(1075)
■ Test signal level monitor function
Video &
Color
ORDERING INFORMATION
Capacitance Meter
KEY FEATURES
■ Test frequencies: 100Hz, 120Hz, 1kHz
■ Basic accuracy: 0.1%
■ High measurement speed: 5ms in 1kHz, 15ms
in 100Hz/120Hz
■ Large LCD display (240x64 dot-matrix)
■ Wide measurement range: 0.1pF ~ 3.999F
■ Standard Handler interface
■ Comparator and pass/fail alarming beeper
function
■ Setups backup function
SPECIFICATIONS
Model
Test Parameter
Test Signals
Test Level
Test Frequency
Output Impedance
Measurement Range
C
Basic Accuracy *1
Measurement Speed(Fast) *2
C, Frequency ≧1kHz
C, Frequency =100Hz, 120Hz
D factor measurement
Trigger
Equivalent Circuit Mode
Interface&Input/Output
Interface
Output Signal
Comparator
Display
Correction Function
Averaging
Memory
General
Operation Environment
Power Consumption
Power Requirements
Dimension (H x W x D)
Weight
Model 11020
The Chroma 11020 Capacitance Meter is a
high-speed precision Capacitance Meter. Provides
100H z, 120H z, a n d 1k H z te s t f re q u e n c i e s.
Measurement time is only 5 milliseconds in
1kHz, and less than 15 milliseconds in 100Hz and
120Hz test frequencies. Combine with 0.1% basic
accuracy and standard Handler interface, enable
the Chroma 11020 can be used on high speed
production line for various capacitors.
ORDERING INFORMATION
11020 : Capacitance Meter
A110104 : SMD Test Cable #17
A110211 : Component Test Fixture
A110212 : Component Remote Test Fixture
A110234 : High Frequency Test Cable
A110236 : 19" Rack Mounting Kit
A110239 : 4 Terminals SMD Electrical Capacitor
Test Box (Patent)
A110244 : High Capacitance Capacitor Test
Fixture
A133004 : SMD Test Box
11020
Capacitance, Dissipation factor
1V(10% + 3mV)
100Hz, 120Hz, 1kHz
Varies as range resistors
0.1pF~3.999F(100Hz, 120Hz), 0.01pF~399.9µF(1kHz)
±0.1%
5ms
15ms
2ms
Internal, External
Series, Parallel
Handler (24pin)
HI/GO/LO judge (Capacitor),GO/NG judge (D factor)
Upper/Lower limits(%, ABS)
240x64 dot-matrix LCD display
Zeroing
1, 2, 4, 8, 16, 32, 64
1 instrument setups
Temperature:10˚C ~ 40˚C, Humidity : < 90 % RH
65VA max.
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
100 x 320 x 347.25 mm / 3.94 x 12.6 x 13.67 inch
5.5 kg / 12.11 lbs
Note*1 : The specification of accuracy is under the following conditions :
1) Warm up time : >10 min. 2) Environment temperature : 23±5˚C 3) OPEN/SHORT offset modification completed
Note*2 : Measurement time includes all of the time for UUT measurement, calculation and primary/secondary parameters identification.
12-7
All specifications are subject to change without notice.
Automatic Transformer Tester
Model 13350
Video &
Color
Semiconductor/
IC
* New features compared to Chroma 3250 Series
ORDERING INFORMATION
13350D : Automatic Transformer Tester Display Unit
13350M-200k : Automatic Transformer Tester Measurement Unit
A133502 : 20CH Scanning Box
A133505 : 80CH Scanning Box
A133506 : C.T. test fixture
A133507 : Connecting Conversion Unit
(I/F of 80CH scan box / provide I/O control
interface/1320 DC bias cable link /
BNC terminals)
A133509 : GPIB Interface
A133510 : LAN & USB-H Interface
A133512 : Transformer Test Software
B133500 : Fiberglass Board
(connecting A133502 with A132501 fixtures)
Electrical
Safety
13350 provides 20Hz-200kHz test frequency
and scan test items to cover low voltage test
parameters for various transformers including
Inductance (L), Leakage (Lk) , Turn-Ratio, DC
Resistance (DCR), Impedance (Z), Stray Capacity
(C), Quality Factor (Q), Equivalent Series Resistance
(ESR), Pin Short (PS), Winding Phase (PH) and
Balance.
Power
Battery Test &
Passive
Electronics Automation Component
The compensation function of 13350 can do
OPEN/SHORT for individual channel to solve the
errors due to different layout on various fixtures.
Automated
Optical Inspection
A133506 C.T. (Current Transformer)
Test Fixture
When the 13350 works with A133506 C.T. Test
Fixture, it can measure the turns, inductance and
DC resistance easily and rapidly by putting in the
C.T. directly.
Photovoltaic Test
& Automation
A133505 80 Channels Scan Box
13350 along with 80 channels scan box can mainly
offer three different applications:
1) RJ-45 & LAN Filter test solution that can test
up to 80 pins one time.
2) Transformer automation solution that can
place 4 transformers on one carrier for scan
test simultaneously.
3) Island-type production line planning that
provides a time division multiplexing module
to increase the equipment utilization rate.
Optical
Devices
KEY FEATURES
■ Compensation for individual channel
■ *Combine measurement unit with scanbox
to reduce measurement errors
■ *USB storage interface
■ *10-100 LAN/ USB-H interface (option)
■ *Built-in programmable 100mA bias
current (RJ-45)
■ *Test frequency, voltage and speed set
separately
■ *Fail Lock function
■ *Auto Test function
■ *Equipped with external standard test on
20ch scan test unit
■ *Reduce the short-circuit loss in
secondary side for leakage (Lk) test
(A133502 20ch scan unit)
■ *Short-circuit pin selectable for every test
item
■ *Multiple language: English &
Simplified Chinese
■ *RS232 interface compatible SCPI
commands
Fo r i n s t a n c e: To r e d u c e h u m a n e r r o r s o n
production line, the13350 Fail Lock function is
able to lock the defect DUT (Device Under Test)
when the test is done to prevent it from flowing
out accidently. In order to cut down the time
for placement, the 13350 Auto Test function
can conduct test directly without pressing the
trigger key. In addition, the 13350 adopts the
design of dual CPU to increase the test speed by
processing the measurement and display units
simultaneously.
Applicable Test Options for Selection
A133502 20 Channels Scan Box
13350 uses split screen that allows the
measurement unit to integrate the 20 channels
scan box without using any connecting wires to
reduce measurement errors. Furthermore, the
20 channels scan box has external standard test
function that can perform verification test directly
without any act of disassembly.
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ Test frequency 20Hz ~ 200kHz
■ Turn Ratio, Phase, L, Q, Lk, ACR, DCR, Cp,
Pin short, Balance
■ Basic accuracy : 0.1%
■ Three different output impedance modes
■ Scan unit/box including :
- 20ch scan test unit
- 80ch* scan box
- C.T.* test fixture
Acquired from many years of marketing
experiences and cumulative results, Chroma
13350 is the newest generation of Automatic
Transformer Tester that not only retains the
merits of old 3250 model but also has many
new functions including the combination of
measurement unit and scan box to reduce
measurement error caused by long wire, C.T. test
fixture and 80/20 channels scan box support,
USB interface for test conditions back-up, LAN
communication interface, separate setting of test
frequency/voltage/speed, Fail Lock function and
Auto Test. It solves the performance and quality
problems as well as human errors occurred on
production line for the transformer industry today.
PXI Test &
Measurement
All specifications are subject to change without notice.
• Continued on next page ➟
12-8
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Model 13350 with A133505,A133507
Automatic Transformer Tester
SPECIFICATIONS
Model
Main Function
Test Parameter
Transformer Scanning
Test Signals Information
Turn
Test Level
Others
Turn
Test
Frequency
Others
Turn
Output
Impedance
Others
Measurement Display Range
L, LK
C
Q, D
Z, X, R
θ
DCR
Turn,Ratio
Ratio (dB)
Pin-Short
Basic Accuracy
L, LK, C, Z, X, Y, R
DCR
θ
Turn, Ratio (dB)
Measurement Speed (Fast)
L, LK, C, Z, X, Y, R, Q, D,θ
DCR
Turn, Ratio (dB)
Judge
Transformer Scanning
Trigger
Display
Equivalent Circuit Mode
Correction Function
Memory
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
12-9
Model 13350
13350
Transformer Scanning Test
Turn Ratio, Phase, Turn, L, Q, Leakage L, Balance, ACR, Cp, DCR, Pin Short
10mV~10V, ±10% 10mV/step
10mV~2V, ±10% 10mV/step
20Hz~200kHz, ± (0.1% + 0.01Hz), Resolution: 0.01Hz
20Hz~200kHz, ± (0.1% + 0.01Hz), Resolution : 0.001Hz (<1kHz)
10Ω, when level≦2V / 50Ω, when level > 2V
Constant = OFF : Varies as range resistors
Constant = 320X : 100Ω ±5% ; Constant = 107X : 25Ω ±5%
Constant=106X : 100mA ±5% (1V setting); for inductive load less than 10Ω,10Ω±10%, for impedance ≧10Ω
0.00001µH~9999.99H
0.001pF~999.999mF
0.00001~99999
0.0001Ω~999.999MΩ
-90.00˚~ +90.00˚
0.01mΩ~99.999MΩ
0.01~99999.99 turns (Secondary voltage less than 100 Vrms)
-39.99dB~+99.99dB (secondary voltage less than 100 Vrms)
11 pairs, between pin to pin
±0.1% (1kHz if AC parameter)
±0.5%
±0.04˚(1kHz)
±0.5% (1kHz)
50 meas./sec.
12 meas./sec.
10meas./sec.
PASS/FAIL judge of all test parameters output from Handler interface, 100 bin sorting for Lk
Internal, Manual, External
Color 640x480 LCD panel
Series, Parallel
Open/Short Zeroing, Load correction
15 instrument setups, expansion is possible via memory card
Temperature:10˚C~40˚C, Humidity: 10%~90% RH
60 VA max.
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz (Auto Switch)
13350M : 58 x 280 x 300 mm / 2.28 x 11.02 x 11.8 inch
13350D : 45 x 140 x 225 mm / 1.77 x 5.51 x 10.03 inch
13350M : Approx. 3.5 kg / 7.71 lbs
13350D : Approx. 1.3 kg / 2.86 lbs
All specifications are subject to change without notice.
Transformer Test System
Model 3250/3252/3302
Electrical
Safety
Semiconductor/
IC
All specifications are subject to change without notice.
3250
3252
3302
3312
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• Continued on next page ➟
12-10
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Model
Test Fixture
A132547 4-4mm Test Fixture
A132572 3.5/4mm Test Fixture
A132573 3.2/3.5mm Test Fixture
A132579 7.5-5mm Test Fixture
A132583 3.0-3.0mm Test Fixture
A132584 3.5-3.5mm Test Fixture
A132585 3.8-3.8 mm Test Fixture
A132586 3.0-4.0 mm Test Fixture
A132563 : WINCPK Transformer Data Statistics &
Analysis Software for Model 3250/3252/3302
PXI Test &
Measurement
A132501 :
Auto Transformer Scanning Box (3001A)
Model 3302
Power
Battery Test &
Passive
Electronics Automation Component
In addition to transformer scanning test function,
the 3252/3302 have LCR Meter function, can
be used in component incoming/outgoing
inspection, analysis and automatic production
line.
Automated
Optical Inspection
Th e 3250/3252/3302 e ve n p rov i d e s e ve ra l
output impedance selection to solve inductance
measurement error problem caused by different
test current caused by different output impedance
provided by different LCR Meters. And, equivalent
turns-ratio calculated from measured inductance
of windings is also provided to improve turnsratio measurement error problem caused by large
leakage magnetic flux in transformer with low
permeability magnetic core.
Photovoltaic Test
& Automation
T h e 3250/3252 p r o v i d e 20H z-200k H z t e s t
frequencies, and 3302 provides 20Hz-1MHz test
frequencies. In addition to transformer scanning
test function, the 3252/3302 have LCR Meter
function. In test items, The 3250/3252/3302 cover
most of transformer's low-voltage test parameters
which include primar y test parameters as
Inductance, Leakage Inductance, Turns-Ratio, DC
resistance, Impedance, and Capacitance (between
windings) etc.; secondar y test parameters
as Quality Factor and ESR etc.; and pin-short
test function. High-speed digital sampling
m e a s u re m e nt te c h n o l o g y co m b i n e d w i t h
scanning test fixture (A132501) design, improve
low-efficiency transformer inspection to be more
accurate and faster.
Optical
Devices
KEY FEATURES
■ Test frequency: 20Hz~200kHz/1MHz,
0.02% accuracy
■ Basic accuracy: 0.1%
■ Different output impedance modes,
measurement results are compatible with
other well-known LCR meters
■ Enhanced Turn Ratio measurement accuracy
for low permeability core
■ Fast Inductance/ Turn Ratio measurement
speed up to 80 meas./sec
■ Fast DCR measurement speed up to
50 meas./sec
■ Graphical and tabular display of swept
frequency, voltage current and bias current
measurements (3252/3302)
■ Build-in 8mA bias for RJ45 transmission
transformer saturation condition (option)
■ Leakage inductance 100 bin sorting and
balance of leakage inductance for TV inverter
transformer
■ ALC (Auto Level Compensation) function for
MLCC measurement (3252/3302)
■ Test fixture residual capacitance compensation
for transformer inductance measurement
■ 1320 Bias Current Source directly control
capability (3252/3302)
■ 320x240 dot-matrix LCD display
■ Support versatile standard and custom-design
test jigs
■ Four-terminal test for accurate, stable DCR,
inductance and turn ratio measurements
■ Built-in comparator; 10 bin sorting with
counter capability (3252/3302)
■ Lk standard value with Lx measure value
■ 4M SRAM memory card, for setup back-up
between units
■ Standard RS-232, Handler, and Printer
Interface, option GPIB Interface for LCR
function only
■ 15 internal instrument setups for store/recall
capability
Flat Panel
LED/
Display Lighting
The 3250/3252/3302 Transformer Test System
are the precision test systems, designed for
transformer produc tion line or incoming/
outgoing inspection in quality control process,
with high stability and high reliability.
Video &
Color
ORDERING INFORMATION
3250 : Automatic Transformer Test System
3250 : Automatic Transformer Test System
with 8mA Bias
3252 : Automatic Component Analyzer
3252 : Automatic Component Analyzer
with GPIB interface
3302 : Automatic Component Analyzer
3302 : Automatic Component Analyzer
with GPIB interface
3302 : Automatic Component Analyzer
with 8mA Bias
3302 : Automatic Component Analyzer
without Transformer Scan
A110104 : SMD Test Cable #17
A110211 : Component Test Fixture
A110212 : Component Remote Test Fixture
A110234 : High Frequency Test Cable
A110239 : 4 Terminals SMD Electrical Capacitor
Test Box (Patent)
A113012 : Vacuum Generator for A132574
A113014 : Vacuum Pump for A132574
A132501 : Auto Transformer Scanning Box
(3001A)
A132563 : WINCPK Transformer Data Statistics &
Analysis Software for USB port
A132574 : Test Fixture for SMD power choke
A133004 : SMD Test Box
A133006 : 1A Internal Bias Current Source
A133019 : BNC Test Lead, 2M (singleside open)
Transformer Test System
SPECIFICATIONS
Model
Main Function
Test Parameter
Transformer Scanning
LCR METER
Test Signals Information
Turn
Test Level
Others
Turn
Test
Frequency
Others
Output
Impedance
Display
Turn
Others
Measurement Display Range
L, LK
C
Q, D
Z, X, R
Y
θ
DCR
Turn,Ratio
Ratio (dB)
Pin-Short
Basic Accuracy
L, LK, C, Z, X, Y, R
DCR
θ
Turn, Ratio (dB)
Measurement Speed (Fast)
L, LK, C, Z, X, Y, R, Q, D,θ
DCR
Turn, Ratio (dB)
Judge
Transformer Scanning
LCR METER
Trigger
Display
Equivalent Circuit Mode
Correction Function
Memory
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
Model
Standard Jig
Test Contact pin
Control
Button
Indicators
Solenoid Valve
Pressure
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
12-11
Model 3250/3252/3302
3250
Transformer Scanning Test
--
3252
3302
Transformer Scanning Test + LCR Meter
Turn Ratio, Phase, Turn, L, Q, Leakage L, Balance, ACR, Cp, DCR, Pin Short
L, C, R, |Z|, Y, DCR, Q, D, R, X,θ, Ratio (dB)
10mV~10V, ±10% 10mV/step
10mV~2V, ±10% 10mV/step
1kHz~200kHz, ± (0.1% + 0.01Hz), Resolution: 0.01 Hz
1kHz~1MHz, ±(0.1%+0.01Hz), Resolution : 0.01 Hz
20Hz~1MHz, ±(0.1%+0.01Hz),
20Hz~200kHz, ± (0.1% + 0.01Hz), Resolution : 0.001 Hz (<1kHz)
Resolution 0.001 Hz (<1kHz)
10Ω, when level≦2V / 50Ω, when level > 2V
Constant = OFF : Varies as range resistors
Constant = 320X : 100Ω ±5% ; Constant = 107X : 25Ω ±5%
Constant=106X : 100mA ±5% (1V setting); for inductive load less than 10Ω,10Ω±10%, for impedance ≧10Ω
0.00001µH~9999.99H
0.00001pF~999.999mF
0.00001~99999
0.00001Ω~99.9999MΩ
0.01nS~99.9999S
-90.00˚~ +90.00˚
0.01mΩ~99.999MΩ
0.01~99999.99 turns (Secondary voltage less than 100 Vrms)
-39.99dB~+99.99dB (seconding voltage less than 100 Vrms)
11 pairs, between pin to pin
0.1% (1kHz if AC parameter)
±0.5%
0.03˚(1kHz)
0.5% (1kHz)
80meas./sec.
50meas./sec.
10meas./sec.
PASS/FAIL judge of all test parameters output from Handler interface, 100 bin sorting for LK
10 bins for sorting & bin sum count output from
-Handler interface/PASS/FAIL judge output from Handler interface
Internal, Manual, External
320x240 dot-matrix LCD display
Series, Parallel
Open/Short Zeroing, Load correction
15 instrument setups, expansion is possible via memory card
Temperature:10˚C~40˚C, Humidity: 10%~90% RH
140 VA max.
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
177 x 430 x 300 mm / 6.97 x 16.93 x 11.81 inch
9.2 kg / 20.26 lbs
A132501
20 pins
Four terminals contact
START, RESET
GO, NG
0.15~0.7Mpa(1.5~7.1kgf/cm2)
Temperature: 10˚C~40˚C, Humidity: 10%~90% RH
40 VA max.
90 ~ 264Vac, 47 ~ 63Hz
90 x 270 x 220 mm / 3.54 x 10.63 x 8.66 inch
3.2 kg / 7.05 lbs
All specifications are subject to change without notice.
Telecom Transformer Test System
Model 3312
Video &
Color
LCR Meter
Test Signals Information
Turn, ILOS,
Test Level
Fr,LBAL
Others
Turn
Test Frequency
Others
Turn, ILOS,
Fr,LBAL
Output Impedance
Others
Constant = OFF : Varies as range resistors
Constant = 320X : 100Ω ±5%
Constant = 107X : 25Ω ±5%
Constant = 106X : 100mA ±5% (1V setting),
for inductive load less than 10Ω, 10Ω ±10%, for impedance ≧ 10Ω
0.00001µH ~ 9999.99H
0.00001pF ~ 999.999mF
0.00001 ~ 99999
0.00001Ω~ 99.9999MΩ
0.01nS ~ 99.9999S
-90.00˚ ~ +90.00˚
0.01mΩ ~ 99.999MΩ
0.01 ~ 99999.99 turns (Secondary voltage less than 100 Vrms)
11 pairs, between pin to pin
-100dB ~ +100dB
0dB ~ +100dB
±0.1% (1kHz if AC parameter)
±0.5%
±0.03% (1kHz)
±0.5% (1kHz)
N/A (Zr : ±0.1%)
±0.5dB
80meas./sec.
50meas./sec.
10meas./sec.
PASS/FAIL judge of all test parameters output from Handler interface
10 bins for sorting & Bin sum count output from optional Handler
interface PASS/FAIL judgement output from standard Handler interface
Internal, Manual, External
320x240 dot-matrix LCD display
Series, Parallel
Open/Short Zeroing, Load correction
15 instrument setups, expansion is possible via memory card
Temperature: 10˚C ~ 40˚C,Humidity: 10%~90% RH
140 VA max.
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
177 x 430 x 300 mm / 6.97 x 16.93 x 11.81 inch
9.2 kg / 20.26 lbs
12-12
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
10Ω, when level ≦ 2V ; 50Ω, when level > 2V
PXI Test &
Measurement
Trigger
Display
Equivalent Circuit Mode
Correction Function
Memory
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
10mV ~ 2V, ±10% 10mV/step
1kHz ~ 1MHz, ± (0.1% + 0.01Hz), Resolution : 0.01 Hz
20Hz ~ 1MHz, ± (0.1% + 0.01Hz), Resolution: 0.001 Hz (<1kHz)
Semiconductor/
IC
LCR Meter
10mV ~ 10V, ±10% 10mV/step
Electrical
Safety
Measurement Range
Lx, x
C
Q, D
Z, X, R
Y
θ
DCR
Turn
Pin-Short
RLOS, ILOS, FR
LBAL
Basic Accuracy
L, LK, C, Z, X, Y, R
DCR
θ
Turn
RLOS
ILOS, FR, LBAL
Measurement Speed (Fastest)
L, LK, C, Z, X, Y, R, Q, D, θ
DCR
Turn, RLOS, ILOS, LBAL
Judge
Transformer Scanning
Turn Ratio (TR), Phase, Turn Inductance (L), Quality Factor (Q),
Leakage Inductance (LK), Inductance Balance (BL), ACR, Capacitance,
DCR, Pin Short, Return Loss (RLOS), Insertion Loss (ILOS),
Frequency Response (FR), Longitudinal balance (LBAL)
L, C, R, IZI, Y, DCR, Q, D, R, X, θ
Power
Battery Test &
Passive
Electronics Automation Component
The 3312 even provides several output impedance
selection to solve inductance measurement error
problem caused by different test current caused
by different output impedance provided by
different LCR Meters.
Transformer Scanning
Automated
Optical Inspection
The 3312 provides 20Hz-1MHz test frequencies.
In addition to transformer scanning test function,
the 3312 has LCR Meter function. In test items,
The 3312 covers most of telecom transformer's
low-voltage test parameters which include
telecom test parameters as Return Loss (RLOS),
Reflected Impedance (Zr), Insertion Loss (ILOS),
Frequency response (FR), and Longitudinal
Balance (LBAL) etc.; primary test parameters
of general transformer as Inductance, Leakage
I n d u c t a n c e, Tu r n s - R a t i o, D C r e s i s t a n c e,
Impedance, and Capacitance (between windings)
etc.; secondar y test parameters of general
transformer as Quality Factor and ESR etc.; and
pin-shor t test function. High-speed digital
sampling measurement technology combined
with scanning test fixture (A132501) design,
improve low-efficiency telecom transformer
inspection to be more accurate and faster.
3312
Transformer Scanning Test + LCR Meter
Photovoltaic Test
& Automation
The 3312 Telecom Transformer Test System is
a precision test system, designed for telecom
transfor mer produc tion line or incoming/
outgoing inspection in quality control process,
with high stability and high reliability.
SPECIFICATIONS
Model
Main Function
Test Parameter
Optical
Devices
KEY FEATURES
■ Includes most test items in telecommunication
transformer inspection.
■ Programmable frequency : 20Hz~1MHz, 0.02%
accuracy
■ Basic accuracy : 0.1%
■ 3 different output impedance modes,
measurement results are compatible with other
well-known LCR meters
■ Enhanced Turn Ratio measurement accuracy
for low permeability core
■ ast Inductance/ Turn Ratio measurement speed
up to 80 meas./sec
■ Fast DCR measurement speed up to
50 meas./sec
■ 1320 Bias Current Source directly control
capability
■ 320x240 dot-matrix LCD display
■ Support versatile standard and custom-design
test jigs
■ Four-terminal test for accurate, stable DCR,
inductance and turn ratio measurements
■ Built-in comparator; 10 bin sorting with
counter capability
■ 4M SRAM memory card, for setup back-up
between units
■ Standard RS-232, Handler and Printer interface,
option GPIB Interface for LCR function only
■ 15 internal instrument setups for store/recall
capability
A110239 : 4 Terminals SMD Electrical Capacitor Test Box
(Patent)
A132501 : Auto Transformer Scanning Box
A133004 : SMD Test Box
A133006 : 1A Internal Bias Current Source
Flat Panel
LED/
Display Lighting
ORDERING INFORMATION
3312 : Telecom Transformer Test System
A110104 : SMD Test Cable #17
A110211 : Component Test Fixture
A110212 : Component Remote Test Fixture
A110234 : High Frequency Test Cable
Bias Current Source
KEY FEATURES
Model 1310
■ Frequency response : 20Hz~200kHz
■ 0.001A~10.00A, 90W output capability
■ Forward / Reverse current switching capability
■ Bias current sweep (2~11points), automatic or
manual trigger, for core characteristics analysis
■ 16x2 LCD text display
■ 0.001Ω~199.99Ω DCR measurement
capability
■ Long term continued maximum power output
capability
■ Excellent protection circuit, keep L Meter from
damage as bias current was broken abnormally
KEY FEATURES
Model 1320
■ Frequency response : 20Hz~1MHz
■ 0.001A~20.00A, 150W output capability,
maximum 100Adc extendable with 1320S
■ Forward / Reverse current switching capability
SPECIFICATIONS
Model
Bias Current Source
Output Current
Accuracy
1310
0.00~10.00Adc
Forward/Reverse
0.000A~1.000:1%+3mA
1.01A~10.00A:2%
Model 1310/1320/1320S/1320-10A
■ Standard GPIB, Handler interface
■ Bias current sweep (2~21points), automatic or
manual trigger, for core characteristics analysis
■ Direct controlled by LCR Meter 3302/3252/
11022/11025
■ 16x2 LCD text display
■ 0.01mΩ~199.99Ω DCR measurement
capability
■ 50 internal instruments setups for store/recall
capability
■ Single bias current output timer capability
(24 hours)
■ Long term continued maximum power output
capability
■ Excellent protection circuit, keep L Meter from
damage as bias current was broken abnormally
ORDERING INFORMATION
1310 : Bias Current Source 0~10A
1320 : Bias Current Source 0~20A
1320-10A : Bias Current Source 0~10A
1320S : Bias Current Source (Slave)
A113011 : 4 Terminals Test Cable with Clip
A115001 : Foot Switch #10
Model 1320/1320-10A
The 1320 Bias Current Source output can be
controlled by LCR Meter Model 3302/3252/11022/
11025 directly. The 1320S connected externally
can output current up to 100A. The bias current
scan frequenc y triggered automatically or
manually can analyze the iron core characteristics
in inductor for quality inspection and product
feature analysis. They are the best measurement
instruments combination for inductor test.
1320
0.00~ 20.00Adc Forward/
Reverse 100A extendable
when linked with 1320S
0.000A~1.000A : 1% +3mA
1.001A~5.00A:2%
5.01A~20.00A:2%
20.1A~20.0(1+X)A:3% *1
Manual or Auto, 2~21 steps
20Hz~1MHz
Model 1320S
1320S
1320-10A
0.00~20.00Adc(Slave)
Forward/Reverse *2
0.00~10.00Adc
Forward/Reverse
3%
0.000A~1.000A:1%+3mA
1.001A~5.00A:2%
5.01A~10.00A:2%
Scan Test
Manual or Auto, 2~11 steps
--Manual or Auto, 2~21 steps
Frequency Response
20Hz~200kHz
20Hz~1MHz
20Hz~1MHz
Maximum Power
Continued Output
> 24 hours (below 40˚C)
Allowable Time
Timer
----0~24 hours
0~24 hours
Delay time
----0.0~100.0 sec/step, adjustable
0.0~100.0 sec/step, adjustable
DCR Meter Accuracy & Resolution
----20mΩ
2% + 0.07mΩ, 0.01mΩ
2%+ 0.07mΩ,0.01mΩ
----200mΩ
2% + 0.2mΩ, 0.1mΩ
2% + 0.2mΩ,0.1mΩ
DCR Range 2Ω
--3% + 0.002Ω,0.001Ω
3% + 0.002Ω,0.001Ω
3%+ 0.002Ω,0.001Ω
--20Ω
3% + 0.03Ω, 0.01Ω
3% + 0.02Ω, 0.01Ω
3%+0.02Ω, 0.01Ω
--200Ω
3% + 0.3Ω, 0.1Ω
3% + 0.2Ω, 0.1Ω
3% + 0.2Ω, 0.1Ω
DCV Display
Display Range
----0.00V~10.00Vdc
0.00V~20.00Vdc
Accuracy
----2% + 0.05Vdc
2% + 0.05Vdc
Display
--16 x 2 text dot matrix LCD
16 x 2 text dot matrix LCD
General
Operation Environment
Temperature : 10˚C~40˚C, Humidity : 10%~90 % RH
Power Consumption
250VA max.
650VA max.
600VA max.
650VA max
Power Requirements
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
132 x 410 x 351 mm /
Dimension (H x W x D)
177 x 430 x 450 mm / 6.97 x 16.93 x 17.72 inch
5.2 x 16.14 x 13.82 inch
Weight
8.8 kg / 19.38 lbs
17.5 kg / 38.55 lbs
15.5 kg / 34.14 lbs
17.5 kg / 38.55 lbs
Note*1 : X is the number of linked 1320S
Note*2 : 1320S is a slave current source of 1320
12-13
All specifications are subject to change without notice.
Bias Current Test System
Model 11300
Video &
Color
This system provides power choke characteristic
sweep graph analysis through Windows® base
software or sweep function of the meter. The
bias current scan triggered automatically or
manually can analyze the iron core characteristics
in inductor for quality inspection and product
feature analysis. The Chroma 11300 is a just right
test solution for magnetic choke and core used in
various power supply.
A113008 :
Four terminal test fixture for DIP 100A
Electrical
Safety
Semiconductor/
IC
A113009 :
Four terminal test fixture for SMD 60A
(combined with A113008)
L-I Curve Software
PXI Test &
Measurement
19" Rack 20U for Model 11300
Power
Battery Test &
Passive
Electronics Automation Component
KEY FEATURES
■ High efficiency, forward / reverse current
switching capability and sweep function
■ High stability, frequency response from
20Hz to 1MHz
■ High accuracy, 3% output current accuracy
■ Expansion capabilities, up to 300A
■ Vertical design, easy to maintain
■ Flexible modular test system
■ Multi-channel intakes in the front panel of rack
and multi-fans exhausts in the back of rack
■ Multi-function four terminal test fixture
■ Low ESR ( < 10m ohm) design for connecters
between bias current sources
■ Windows® based software
Automated
Optical Inspection
300A
Graphical Bias Current Characteristic Analysis
11300
60A
80A
100A
100A~300A
•
•
•
*
•
2 Sets
•
3 Sets
•
4 Sets
*
*
35U
180~264Vac, 47~63Hz
*
*
* Call for availability
All specifications are subject to change without notice.
12-14
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
SPECIFICATIONS
Model
20A
40A
Output Bias Current
LCR Meter
Model 3252/3302
•
•
Bias Current Source
*Please
refer to respective product catalogs
for detail specifications
Model
•
•
1320
Model 1320S
1 Set
General
19"Rack
20U
Power Requirements
Photovoltaic Test
& Automation
The connector between bias current sources is low
ESR (<10m ohm ) design to reduce heat effect and
get more accurate measurement result. The multifunction four terminal test fixture supports various
DUT, include SMD DUT and DIP ring core DUT.
Optical
Devices
It consists of Chroma 3252/3302 series Automatic
Component Analyzer and Chroma 1320 series
Bias Current Source. The Chroma 1320 series
bias current source output can be controlled by
Chroma 3252/3302 LCR meter directly. The bias
current output capacity can be selected up to
300A to satisfy various testing in R&D, QC, QA, and
production applications.
ORDERING INFORMATION
11300 : Bias Current Test System
A113008 : Four terminal test fixture for DIP 100A
A113009 : Four terminal test fixture for SMD 60A
(combined with A113008)
A113010 : Four terminal PCB for SMD 100A
(combined with A113008)
A113012 : Vacuum Generator for A113009
A113014 : Vacuum Pump for A113009
A113017 : LCR Analysis Software
LCR Meter : Refer to 3252, 3302
Bias Current Source : Refer to 1320, 1320S
A800004 : 19" rack 20U/35U/41U for Model 11300
Flat Panel
LED/
Display Lighting
Chroma 11300 bias current test system is an
integration test system of LCR Meter and Bias
Current Source.
Electrolytic Capacitor Analyzer
KEY FEATURES
■ C meter provides Z/C/D/Q/ESR parameters for
test
■ Available 7 test frequencies from 100~100kHz
for selection
■ 0.1% basic measurement accuracy
■ The thin-film withstand voltage results can be
displayed in graph by converting them to an
actual rising curve
■ CPK calculation function for 1000 capacitor
test results that is convenient for analyzing the
production capability
■ 320 x 240 dot-matrix LCD display
■ 200 sets of internal memories and 4M SRAM
interface card for saving and recalling the
parameter settings
■ Designed for100mΩ range with accuracy
measurement up to 0.1mΩ
■ Non-Relay switch is built in. It is safe and
reliable as the discharge circuit is close to the
fixed power
■ Perform electric polarity test before charge to
avoid the danger of explosion
■ Softpanel for leakage current data statistics
analysis
■ Equipped with RS-232, printer and scanner
controller interfaces
■ Meet the test regulation of EIAJ RC-2364A
■ A131001 scan box has four terminals designed
for measuring accurate high frequency and
low impedance (200 Vmax)
12-15
Model 13100
T h e C h r o m a 13100 E l e c t r o l y t i c C a p a c i t o r
Analyzer is a general measurement instrument
designed for analyzing the features of electrolytic
cap acitor s. It has multip le f unc tions that
can be programmed based on the capacitor
features by altering the settings to test metal
oxidization thin-film withstand voltage, capacitor
leakage current, capacitance, dissipation factor,
impedance and equivalent serial resistance, etc.
ORDERING INFORMATION
13100 : Electrolytic Capacitor Analyzer
A131001 : 10 Channels Switching Test Fixture
A131002 : 4T BNC to BNC Lead
Used with the special designed sequential switch
test box A131001, it can complete the test for
multiple capacitors or aluminum foil rapidly,
accurately and simultaneously in a short time
without changing any test wire.
The report printing function is capable of printing
the test results correctly and completely; and the
built-in data calculation function can compute
the test data of the product instantly for CPK
analysis. To avoid the inefficient calculation
p r o c e s s d o n e m a n u a l l y, a t e s t s o f t w a r e
application is also available for you to create a
quality report easily. It meets the EIAJ RC-2364A
regulations for electrolytic capacitor test and is a
test instrument of choice.
Chroma A131001 is a sequential switch test
box of ten channels specially designed for
Chroma 13100. Each test socket on the test
box is implemented with Kelvin measurement,
which is suitable for the precise measurement
requirement for low impedance and low leakage
current. With the SCAN function in 13100 it is
able to control the C, D, Q, Z, ESR and LC tests for
electrolytic capacitor to be done consecutively
without switching the capacitor manually. This
increases the test efficiency significantly as it
costs only 1/10 of the original test time.
A131001 : 10 Channels Switching Test Fixture
(200 Vmax)
13100 Softpanel
All specifications are subject to change without notice.
Electrolytic Capacitor Analyzer
Video &
Color
13100
C Meter/Leakage Current Tester/Foil WV Tester/Scanner Controller
Flat Panel
LED/
Display Lighting
Cs-D, Cs-Q, Cs-ESR, Cp-D, Cp-Q, |Z|-ESR, |Z|-θ
1.0V/0.25V, ±10%
100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 50kHz, 100kHz; ±0.01%
25Ω, 100Ω, 25Ω/C.C, 100Ω/25Ω four mode selectable
Optical
Devices
0.001pF ~ 1.9999F / ±0.1%
0.01mΩ~ 99.99MΩ/ ±0.1%
0.0001 ~ 9999 / ±0.0005
-90.00˚ ~ +90.00˚ / ±0.03˚
Photovoltaic Test
& Automation
Freq. = 100Hz 120Hz : 55ms / 120ms/ 750ms; Freq 1kHz : 35ms / 60ms / 370ms
Open / Short zeroing
1~99 times
Vm, Im
Automated
Optical Inspection
LC, IR
1.0 V ~ 100 V, step 0.1 V;101V~650 V, step 1V; (0.5% + 0.2V)
V ≦ 100V: 0.5mA~500mA; V>100V: 0.5mA~150mA; step 0.5mA; (3% + 0.05mA)
Power
Battery Test &
Passive
Electronics Automation Component
0.001µA ~ 99.9mA/ ±(0.3% +0.005µA)
45ms
Null zeroing
1 ~ 99 times
Vm: 0.0 V ~ 660.0V; (0.2%+0.1V)
0 ~ 999 sec.
Tr (Rise Time), Vt (Foil Withstand Voltage), Plot [logT, Vm]
650 V typical
0.5mA~100mA, step 0.5mA; (3% +0.05mA)
0.05 ~ 120.00 sec.
0.1V ~ 660.0V
220 plots; Vm: 1.5~10 x Vf
30 ~ 600 sec.
Electrical
Safety
Semiconductor/
IC
Chroma A131001
C parameter pair x 2, LC parameter x 1
1~1000 pcs.
Fixture Open/ Short/ Null zeroing
Upper, Lower
Maximum, Minimum, Average (X bar), Cpk
RS-232, Printer, Scanner Control Interface
320 x 240 dot-matrix LCD display
PXI Test &
Measurement
200 instrument setups
200 instrument setups (for copy and backup)
Internal, Manual, BUS, Scanner
Temperature 0˚C~40˚C, Humidity < 90 % RH
400 VA max.
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
177 x 430 x 301.4 mm / 6.97 x 16.93 x 11.87 inch
14 kg / 30.84 lbs
Note*1 : 23±5˚C after Open and Short correction, slow measurement speed, refer to Operation Manual for detail measurement accuracy descriptions
Note*2 : 23±5˚C after Null correction, average exceeds 10 times, refer to Operation Manual for detail measurement accuracy descriptions
Note*3 : C/D meter in range >1Ω, refer to Operation Manual for detail
All specifications are subject to change without notice.
12-16
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
SPECIFICATIONS
Model
Main Function
C Meter
Test Parameter
Test Signals
Level
Frequency
Source Ro
Measurement Display Range/ Basic Accuracy *1
C
Z, ESR
D, Q
θ
Measurement Speed *2
Fast/Medium/Slow
Function
Correction
Averaging
Test Signal Monitor
Leakage Current Tester
Test Parameter
Test Signals
Voltage
Charge Current Limit
Measurement Display Range/ Basic Accuracy *3
LC (Leakage Current)
Measurement Speed
Function
Correction
Averaging
Test Voltage Monitor
Charge/ Dwell Timer
Foil WV Tester
Test Parameter
Test Signals
Voltage Limit
Constant Charge Current
Test Display Range
Tr (Rise Time)
Charge Voltage
Plot [logT, Vm]
Test Time
Scanner Controller
Controllable Fixture
Test Parameter
Sample Number
Function
Correction
Comparison Limit
Statistics
Interface
Display
Memory (Store/Recall)
Internal
4M SRAM card (Option)
Trigger
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
Model 13100
Ripple Current Tester
KEY FEATURES
■ Digital constant current output and constant
peak voltage output control function
■ Four terminal contact test jig design, ensure
accurate monitoring of voltage dropped on
capacitors under test (patent pending)
■ Paired cooper-foil wiring test cable to reduce
voltage drop on the current driving loop and to
ensure accurate monitoring of ac level dropped
on capacitors under test (patent pending)
■ 0-500 V DC bias voltage source, 0.3% basic
accuracy
■ 0.01~30A, 100Hz/120Hz/400Hz/1kHz AC ripple
current source, (±0.5% reading+0.1% of
range) basic accuracy (Model 11800)
■ 0.01~10A, 20kHz~100kHz AC ripple current
source, 2% basic accuracy (Model 11801)
■ 0.03~10A, 20kHz~1MHz AC ripple current
source (Model 11810)
■ Monitoring software (option) for multiple
Ripple Current Testers
■ Lower power consumption and lower
electricity cost
■ Large LCD display (320 x 240 dot-matrix)
■ Alarm for indicating of normal or abnormal test
termination, Tested time will be recorded if the
test is terminated abnormally. An automatic
discharge is always performed after test
termination
■ Standard RS485 interface is provided for
computer monitoring
■ Optional 20-fixtures Series or Parallel test jigs
■ Digital timer inside
■ CE marking (Model 11800/11801)
The Chroma 11800/11801/11810 Ripple Current
Tester is a precision tester designed for electrolytic
capacitors load life testing. Provides constant
ripple current output and constant peak voltage
(Vpeak = Vdc + Vac_peak) output digital control
function. Let load life testing for electrolytic
capacitors becomes easier and more reliable. And,
The Chroma 11800/11801/11810 use excellent
output amplifier design technology to reduce
power consumption and internal temperature
rising. For long time testing requirement, it can
reduce electricity cost and perform high stability.
The Chroma 11800/11801/11810 is a just right test
solution for electrolytic quality evaluation.
12-17
Model 11801
Model 11800/11801/11810
A118029 : SMD Series Test Fixture for Low Voltage
ORDERING INFORMATION
11800 : Ripple Current Tester 1kHz
11801 : Ripple Current Tester 100kHz
11810 : Ripple Current Tester 1MHz
A118004 : Series Test Fixture
A118005 : Parallel Test Fixture
A118010 : Monitoring Software for
Model 11800/11801
A118028 : Series Test Fixture for Low Voltage
A118029 : SMD Series Test Fixture for Low Voltage
A118030 : PCB for SMD Capacitor
A118010 : Monitoring Software for 11801/11800
SPECIFICATIONS
Model
Ripple Current Source
Current Output Range
Frequency
0.010A~0.199A
Accuracy 0.20A~1.99A
*1
2.0A~10A
11800
11801
11810
0.01~30A
100Hz/120Hz/400Hz/
1kHz ±0.1%
0.01~10A
0.03~10A, *3
20kHz~100kHz
20kHz~1MHz
± (3% + 0.005 A)
± (2.5% + 0.05 A)
0.03~0.39A,
±(3% + 0.01 A), *2
0.40~10.0A,
±(2% + 0.05 A), *2
± (0.5% of reading +
0.1% of range)
± (2% + 0.2 A)
-10.0A~30A
90Vrms / 10Arms,
Ripple Voltage Output
15Vrms maximum
30Vrms / 30Arms
Range
DC Bias Voltage Source
DC 0.5 ~ 500V, ± (0.3% + 0.05V)
Voltage Output Range
200mA, 40W Maximum
Charge Current
Signal Monitor Parameter Accuracy
0.001A~0.199A
0.030A~0.399A:
± (2% + 0.005 A)
0.20A~1.99A
± (2% + 0.05 A)
Irms
±(3% +0.01A),*2, *3
± (0.5% of reading +
0.400A~10.00A:
(Ripple
2.0A~10A
0.1% of range)
± (2% + 0.2 A)
Current)
±(2% +0.05A),*2, *3
-10.0A~30A
Vpeak
Vpeak =Vdc + Vac_peak
(Normally, set to
capacitor rated voltage)
Vdc (DC Bias Voltage)
± (0.3% + 0.05V)
0~1.99V, ± (0.3% of
reading + 0.5% of range)
2.00~19.99V, ± (0.3% of
reading + 0.1%of range)
Vrms (Ripple Voltage)
± (1% + 0.005V)
± (1% + 0.01V) *2
20.00V~200.0V,
± (0.3% of reading +
0.1%of range)
Control Function
Timer
1 min~10000 hour, 30min error per year
Interface
RS-485 (Standard)
Display
320 x 240 dot-matrix LCD display
Operation
Start, Stop, Continue
Protection
OCP, OTP, Over Load
General
Operation Environment
Temperature : 10˚C~40˚C, Humidity : < 90 % RH
Power Consumption
3000 VA max.
700 VA max.
1000VA max.
Power Requirement
198 ~ 242Vac, 47 ~ 63Hz
221.5 x 440 x 609.8 mm / 353.6 x 440 x 609.8 mm / 221.5 x 440 x 609.8 mm /
Dimension (H x W x D)
8.72 x 17.32 x 24.01 inch 13.92 x 17.32 x 24.01 inch 8.72 x 17.32 x 24.01 inch
Weight
54 kg / 118.94 lbs
60 kg / 132.16 lbs
40 kg / 88 lbs
Note*1 : 23 ± 5˚C
Note*2 : Multiple accuracy for test frequency 20~100kHz (x 1), 101~500kHz (x 2.5), 501kHz~1MHz (x 5)
Note*3 : Frequency > 500kHz : 0.10~10.0A only
Note*4 : Frequency > 500kHz : 0.100~10.00A only
All specifications are subject to change without notice.
CLC/IR Meter
Charge Current Limit
Power
Battery Test &
Passive
Electronics Automation Component
Voltage
Automated
Optical Inspection
SPECIFICATIONS
Model
Main Function
Test Parameter
Test Signals Information
A112004 : Softpanel of Model 11200
11200 (650V)
11200 (800V)
Capacitor Leakage Current / IR Meter
LC, IR
PXI Test &
Measurement
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
12-18
Semiconductor/
IC
Measurement Display Range
Basic Measurement Accuracy *1
Measurement speed
Fast
(Ext. Trigger, Hold Range, Medium
Slow
Line Frequency 60Hz)
Function
Correction
Null zeroing
Test Voltage Monitor
Vm: 0.0 V~660.0V; ±(0.2% of reading + 0.1V)
Vm: 0.0 V~900.0V; ±(0.2% of reading + 0.1V)
Charge Timer
0~999 sec.
Dwell Timer
0.2~999 sec.
Foil WV Tester
Test Parameter
Tr (Rise Time), Vt (Foil Withstand Voltage)
Voltage Limit
650 V typical
800V typical
Constant Charge
Test Signals
0.5mA~150mA, step 0.5mA;
0.5mA~50mA, step 0.5mA;
Current
±( 3% of reading + 0.05mA)
±( 3% of reading + 0.05mA)
Tr (Rise Time)
0.05~600.0 sec.
Test Display Range
Charge Voltage
0.1V~660.0V
0.1V~900.0V
Test Time
30~600 sec.
Interface
RS-232(Standard), Handler, GPIB (Optional)
Display
240 x 64 dot-matrix LCD display
Trigger
Internal, External, Manual, BUS
General
Operation Environment
Temperature : 10˚C~40˚C Humidity : < 90 % RH
Power Consumption
400 VA max.
Power Requirement
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
Dimension (H x W x D)
100 x 320 x 346.1 mm / 3.94 x 12.6 x 13.63 inch
Weight
8 kg / 17.62 lbs
Note*1 : 23 ± 5˚C after null correction. Refer to Operation Manual for detail measurement accuracy descriptions.
Electrical
Safety
1.0 V~100 V, step 0.1 V;
1.0 V~100 V, step 0.1 V;
101V~650 V,step 1V; ±( 0.5% + 0.2V)
101V~800V,step 1V; ±( 0.5% + 0.2V)
V ≦ 100V: 0.5mA~500mA, 50W max.
V ≦ 100V: 0.5mA~500mA, 50W max.
V > 100V: 0.5mA~150mA, 97.5W max.
V > 100V: 0.5mA~50mA, 40W max.
step 0.5mA; ±( 3% + 0.05mA)
step 0.5mA; ±( 3% + 0.05mA)
LC : 0.001µA~20.00mA
LC Reading : ±(0.3% + 0.005μA)
77 ms
143 ms
420 ms
All specifications are subject to change without notice.
Photovoltaic Test
& Automation
Contact failure between a DUT and the
measurement plane of an automatic component
handler is a factor for compare error in production
line testing. Contact check using the built-in
measurement function (option) improves the
accuracy and efficiency of comparing.
ORDERING INFORMATION
11200 : Capacitor Leakage Current / IR Meter 650V
11200 : Capacitor Leakage Current / IR Meter 800V
11200 : Capacitor Leakage Current / IR Meter
with contact check function 650V
A110235 : GPIB & Handler Interface
A110236 : 19" Rack Mounting Kit
A112001 : Triangle Test Fixture
A112004 : Softpanel for Model 11200
Optical
Devices
The Chroma 11200 Capacitor Leakage Current/IR
Meter is Chroma's newest digital leakage current
meter. Provides DC 1~650 V, 0.5mA~500mA
(150mA for V>100V) DC power source or DC
1~800V, 0.5m A~500m A (50m A fo r V>100V )
DC power source. Mainly used for electrolytic
capacitor leakage current testing, and aluminumfoil withstand voltage testing (EIAJ RC-2364A).
And also can be used for active voltage checking
or leakage current testing of absorber, Zener
diode, and Neon lamp etc.
Standard RS-232 interface, optional GPIB & Handler
interface, high speed and stable measurement
capabilities enable the Chroma 11200 can be used
for both component evaluation on the production
line and fundamental leakage current testing for
bench-top applications.
Flat Panel
LED/
Display Lighting
■ 0.001uA - 20.00mA leakage current test range
with 4 digits resolution
■ Standard RS-232 interface
■ Optional GPIB & Handler interface
■ Digital timer inside
■ Comparator and pass/fail alarming beeper
function
■ Large LCD display (240 x 64 dot-matrix)
■ Friendly user interface
■ Easy use graphic user interface : softpanel
(Option)
Video &
Color
KEY FEATURES
■ Electrolytic capacitor leakage current test
function
■ Insulation Resistance (IR) test function
■ Constant current DC power source with
discharge function
■ Forward voltage function for Diode, LED, Zener
Diode and Varistor
■ Surge voltage test function for electrolytic
capacitor (JIS C5101/5102/5140/5141)
■ Option contact check function to improve test
reliability
■ Basic accuracy: 0.3%
■ Aluminum-foil withstand voltage and rise-time
test function (For EIAJ RC-2364A)
■ Precision low constant current charge
capability (0.5mA ± 0.05mA, meet EIAJ
RC-2364A requirement for withstand voltage
testing of lower WV aluminum-foil)
■ Large charge current (500mA) capability to
fasten charge speed
■ 1.0V ~ 650V / 800V DC voltage source
Model 11200
Programmable HF AC Tester
Chroma 11802 S er ies Programmable H igh
Frequency AC Tester is a digital controlled high
frequency AC source platform, can be combined
with high frequency voltage/current step-up
module to provide high voltage/high current.
Chroma 11802 Series output test frequency
is 20kH z~200kH z, which cover application
frequency range for various SMPS, LCD inverter
and etc.
Programmable HF AC Tester
Model 11802/11803/11805
HF Hipot Tester
Model 11890
HF HV Load Life Tester
Model 11891
KEY FEATURES
■ HF HV Load Life Test (CV and CC mode)
■ HF Withstand Voltage Test (CV and CC mode)
■ HF Breakdown Voltage Test (CV mode)
■ Test frequency: 20kHz ~1MHz
■ Wide output voltage and current range while
combine with different module (Module is
customized and based on the tester's power)
■ Output voltage and current monitor
■ Programmable output voltage waveform
control
■ Cycle count mode or time count mode for load
life test timer
■ Lower power consumption and lower
temperature rising design
■ Large LCD display (320 x 240 dot-matrix)
■ Built-in digital timer
APPLICATION LIST
Model Primary Function
HF, HV, CV
11802
11803
Model 11802/11803/11805/11890/11891
Chroma 11802 Series provides digital functions,
like programmable sine-wave output voltage
controller to simulate the operation condition for
DUT, and cycle count mode or timer mode for load
life test, etc. Chroma 11802 Series uses tracking
DC source inside for output amplifier to reduce
power consumption and lower temperature rising.
It reduces electricity cost and improves stability
for long time testing. It is the best choice to
perform quality verification for various electronic
components which used under high frequency,
like LCD Inverter and module, high voltage
capacitors, primary of SMPS main power, CCFl,
HCFl, and EEFl etc.
ORDERING INFORMATION
11802 : Programmable HF AC Tester 500VA
11803 : Programmable HF AC Tester 800VA
11805 : Programmable HF AC Tester 1000VA
11890 : HF Hipot Tester 500VA
11891 : HF HV Load Life Tester 500VA
H.F. Current Step-up Module
- A118011 : 10V/50A max.
- A118015 : 33V/30A max.
- A118019 : 16V/30A max.
- A118037 : 30V/25A max.
H.F. Voltage Step-up Module
- A118014 : 2.5kV/200mA max.
- A118016 : 250V/2A max.
- A118017 : 8kV/60mA max.
- A118018 : 1kV/1A max.
- A118031 : 5kV/100mA max. (with shielding)
- A118032 : 1kV/500mA max.
- A118034 : 2.5kV/400mA max.
Chroma 11890 is the best tester for production
line of HF HV electronic components withstanding
voltage test, like LCD inverter transformer, ceramic
capacitor, cable, PCB, automatic motor corona
discharge inspection and medical equipment high
frequency leakage current safety inspection.
Chroma 11891 is a tester with only function HF HV
Option
A118013 HF HV 5kV/100mA max
A118014 HF HV 2.5kV/200mA max
A118017 HF HV 8kV/100kHz max
A118031 HF HV 5kV/100mA max + shielding
Step-up current test module +
specified resonant inductor/ capacitor
Ripple Current Test Module
HF, HI, CC,
Chroma 11200 CLC / IR Meter
Bias voltage
(for DC voltage source with discharge function)
Step-up current test module + AC/DC coupling test fixture
HF, CV,
Chroma DC power supply (for DC bias current)
Bias current
Chroma 12061 Digital Multimeter
Temperature meter
(for temperature measurement)
HF, HV, CV
HF HV test module
(or + DC source)
Option Chroma DC source
Step-up current test module + AC/DC coupling test fixture
HF, CV,
Chroma DC power supply (for DC bias current)
Bias current
Chroma 12061 Digital Multimeter
Temperature meter
(for temperature measurement)
HF, HV, CV
11890
HF, HV, CV
A118013 HF HV 5kV/100mA max
A118014 HF HV 2.5kV/200mA max
A118031 HF HV 5kV/100mA max + shielding
11805
HF, HI, Bias voltage
HF, HV
A118015 HF, HI 33V/30A max.
A118018 HF, HV 1kV/1A max.
11891
HF, HV, CV
A118013 HF HV 5kV/100mA max
A118014 HF HV 2.5kV/200mA max
12-19
Load Life Test (CV and CC mode). It is suitable for
passive component load life test.
Application Description
LCD inverter transformer (ceramic capacitor, cable,
PCB) load life / withstanding voltage / breakdown voltage test
EEFl, backlight load life / lamp current test
SMPS main transformer and active PFC choke load life test
and electrical analysis
Medical equipment high frequency leakage current safety inspection
Automobile motor corona discharge inspection,
analysis and production line
Ballast capacitor / inductor ignition voltage load life test
Snubber capacitor load life test
DC-DC converter SMD power choke temperature rising test
(DC Bias current with AC ripple voltage) and electrical analysis
Function as HF HV AC +DC power source for
FFl and SED device analysis
DC-DC converter SMD power choke temperature rising test
(DC Bias current with AC ripple voltage) and electrical analysis
LCD inverter transformer( ceramic capacitor, cable, PCB)
withstanding voltage test for production line
Medical equipment high frequency leakage current safety inspection
Automobile motor corona discharge inspection for production line
Snubber capacitor load life test
High voltage capacitor load life test
Passive Component
(inverter transformer, ceramic capacitor, cable, PCB etc.)
High Frequency and High Voltage Load Life Test
All specifications are subject to change without notice.
Programmable HF AC Tester
Range (rms)
11890
11891
20kHz~200kHz, step 1kHz
11803
10kHz~200kHz,
step 1kHz
20kHz~1MHz,
step 1kHz
1~143V, step 1 V
5.6A maximum
800VA
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Photovoltaic Test
& Automation
±0.02%
165V maximum, step 1 V
±(5% of setting + 0. 5V)
±(4% of reading + 0. 5V)
0.01A ~ 3.10A
0.05A ~ 6.20A
±(5% of setting + 0.5A)
±(4% of reading + 0.5A)
500VA
1kVA
2700 VA max.
Tester
11802/
11890/ 11805
11891
H.F. Current Step-up Modules
●
A118011
●
A118015
●
A118019
A118037
11803
●
Frequency
(kHz)
Max. Current Output
0.1V~10V, ±(5% of setting + 0.05V) *2
0.5V~33V, ±(5% of setting + 0.15V) *2
0.2V~16V, ±(5% of setting + 0.1V) *2
2.5A~50A, ±(4% of setting + 0.05A) *2
0.2A~30A, ±(4% of setting + 0.1A) *2
0.2A~30A, ±(4% of setting + 0.1A) *2
0.5A~25.0A (500kHz), 0.5A~15.0A (1MHz),
±(3% of setting + 0.2A)
200 kHz
200 kHz
200 kHz
1mA~200mA, ±(4% of setting + 0.3mA) *2
0.01A~2A, ±(4% of setting + 5mA) *2
60mA (100kHz)
0.01A~1A, ±(4% of setting + 3mA) *2
0.5mA~100mA, ±(4% of setting + 0.3mA) *2
2.5mA~500mA, ±(4% of setting + 1mA) *2
1.5mA~400mA, ±(4% of setting + 0.2mA) *2
200 kHz
200 kHz
200 kHz
200 kHz
200 kHz
200 kHz
200 kHz
0.50V~30V, ±(4% of reading + 0.3V)
0.05kV~2.50kV, ±(5% of setting + 0.01kV) *2
5V~250V, ±(5% of setting + 1V) *2
0.05kV~8.00kV, ±(5% of setting + 0.02kV) *2
0.05kV~1.00kV, ±(5% of setting + 0.01kV) *2
0.05kV~5.00kV, ±(5% of setting + 0.01kV) *2
0.05kV~1.00kV, ±(5% of setting + 0.01kV) *2
0.01kV~2.5kV, ±(5% of setting + 0.01kV) *2
1 MHz
12-20
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
PXI Test &
Measurement
Note*1 : Under rated load and voltage correction is well performed
Note*2 : For test frequency above 100kHz, multiply the accuracy error by 2 times
Semiconductor/
IC
Voltage Output
Electrical
Safety
H.F. Voltage Step-up Modules
●
A118014
●
A118016
●
A118017
●
A118018
●
A118031
●
A118032
●
A118034
Specification of Modules
Power
Battery Test &
Passive
Electronics Automation Component
Modules
Automated
Optical Inspection
1 min ~ 10000 hour, 30min error per year
0.1 sec ~ 999.9 sec
Temperature : 10˚C~ 40˚C, Humidity : < 90% RH
2700 VA max.
3000 VA max.
198 ~ 242Vac, 47 ~ 63Hz
241.5 x 440 x 609.8 mm / 8.72 x 17.32 x 24.01 inch
32 kg /70.48 lbs
Optical
Devices
Frequency accuracy accuracy
Range (rms)
Output Voltage
accuracy
reading
Range (rms)
Output Current
accuracy
reading
Maximum Output Power
HF HV Load Life Test (CV)
HF HV Load Life Test (CC)
Output mode
HF WV Test (CV)
HF WV Test (CC)
HF Breakdown Voltage Test
Control Function
Load Life Test
Timer
WV Test
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
11805
Flat Panel
LED/
Display Lighting
Frequency
11802
Video &
Color
SPECIFICATIONS
Model
AC Output
Model 11802/11803/11805/11890/11891
Milliohm Meter
Model 16502
Vx
D U T, like p r i m a r y o f t r a ns f o r m e r (mu l t iturn) measurement with Measurement Delay
Function to avoid the test current not produced
that effect by high inductance DUT during test
period.
KEY FEATURES
■ Basic accuracy : 0.05%
■ Pulsed test current output mode is used to
reduce thermal EMFs affection on milliohm
measurement
■ DC test current output mode is used to fasten
measurement speed for inductive DUT
■ Dry-circuit test current output mode (limited
Max. 20mV) is used to measure such contact
resistances where the maximum open-circuit
voltage must be limited to 50mV
■ Temperature correction (TC function)
regardless of material or temperature
■ Useful temperature conversion function for
motor/ coil evaluation
■ 4 channels R scan with balance check function
for fan motor (combined with A165017 option)
■ 0.001mΩ~1.9999MΩ wide measurement
range with 4½ digits resolution
■ Standard RS-232 interface
■ Optional GPIB & Handler interface
■ Bin-sorting function
■ Comparator and pass/fail alarming beeper
function
■ Large LCD display (240 x 64 dot-matrix)
■ Friendly user interface
■ LabView® Driver
T h e C h r o m a 16 5 0 2 M i l l i o h m M e t e r i s
C h r o m a's n e w e s t d i g i t a l M i l l i o h m M e t e r.
0. 0 01mΩ~1.9 9 9 9 MΩ w i d e m e a s u r e m e n t
range. DC, Pulsed, and Dry-circuit test current
driving modes, enable the Chroma 16502 can be
properly used in DC resistance measurement for
various inductive components (coil, choke, and
transformer winding etc.), cable, metallic contact
(connector, relay switch etc.) and conduction
materials.
Using the A165014 Temperature Compensation
Card with A165015 PT100 Temperature Probe,
resistance values measured at ambient
temperature can be corrected by applying a
thermal coefficient so that the display shows
the corresponding resistance values at any
other temperature with temperature correction
function. Temperature increase (Δt) is obtained
and displayed by conver ting resistance
measurements and ambient temperature with
convenient temperature conversion function.
This function is especially useful for verifying
motor windings or coils, where the maximum
temperature increase needs to be determined
when current is applied.
Pulsed ± function application includes power
choke, switch/Relay contract, multi-braided
twisted wires, metallic foil or conductive material,
thermo-sensitive material (fuse, thermistor
sensor) etc. Dry Circuit function application
includes switch /relay contract, thermo-sensitive
material (fuse, thermistor sensor) etc. DC+
function application includes high inductance
12-21
Standard RS-232 interface, optional GPIB &
Handler inter face, high speed and stable
measurement capabilities enable the Chroma
16502 c a n b e u s e d f o r b o t h co m p o n e n t
evaluation on the production line and milliohm
measurement for bench-top applications.
I+
Vemf
V Vx
R
Vemf
IVemf = Thermoelectric EMFs
I+
Vemf
Vx - Vemf = IR Vemf = Thermoelectric EMFs
ORDERING INFORMATION
16502 : Milliohm Meter
A110235 : GPIB & Handler Interface
A110236 : 19" Rack Mounting Kit
A113012 : Vacuum Generator for A165018
A113014 : Vacuum Pump for A165018
A165013 : GPIB and Handler Interface with
Temperature Compensation
A165014 : Temperature Compensation Card
A165015 : PT100 Temperature Probe
A165016 : Pin Type Leads (flat)
A165017 : 4 Channels R Scanner
A165018 : Test Fixture for SMD Power Choke
A165019 : Pin Type Leads (taper)
A165022 : Four Terminal Test Cable
SPECIFICATIONS
Model
16502
Range Basic Measurement Accuracy *1;Test Current
20mΩ
±(0.1% of reading + 0.03 % of range) ; 1A typical
200mΩ
±(0.05% of reading + 0.03 % of range) ; 100mA typical
2Ω
±(0.05% of reading + 0.03 % of range) ; 10mA typical
20Ω
±(0.05% of reading + 0.03 % of range) ; 1mA typical
200Ω
±(0.05% of reading + 0.02 % of range) ; 1mA typical
2kΩ
±(0.05% of reading + 0.01 % of range) ; 1mA typical
20kΩ
±(0.1% of reading + 0.01% of range) ; 100µA typical
200kΩ
±(0.2% of reading + 0.01 % of range) ; 10µA typical
2MΩ
±(0.3% of reading + 0.01 % of range) ; 1µA typical
Test Signal
Drive Mode
DC+, DC-,Pulsed+, Pulsed -, Pulsed ±, Stand by
Open Circuit Voltage less than 20mV;
Dry Circuit
for 200mΩ, 2Ω, 20Ω ranges only
Measurement Time *2
Fast
65ms
Medium
150ms
Slow
650ms
Temp. Correction / Conversion Function
-10.0˚C ~ 39.9˚C
Temperature
±(0.3% of reading+0.5˚C) *3
Measurement
40.0˚C ~99.9˚C
±(0.3% of reading+1.0˚C) *3
Accuracy (Option)
Temp. Sensor Type (Option)
PT100/ PT500
Interface & I/O
Interface
RS-232(Standard) , GPIB, Handler (Optional)
Output Signal
Bin-sorting & Pass/Fail judge
Comparator
Upper/Lower limits in value
Bin Sorting
8 bin limits in %, ABS
Trigger Delay
0~9999ms
Internal, Manual, External, BUS
Trigger
240 x 64 dot-matrix LCD display
Display
Zeroing
Correction Function
General
Operation Environment
Temperature : 10˚C~40˚C,Humidity : < 90 % R.H.
Power Consumption
80 VA max.
Power Requirement
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
Dimension (H x W x D)
100 x 320 x 346 mm / 3.94 x 12.6 x 13.62 inch
Weight
4.2 kg / 9.25 lbs
Note*1 : 23 ± 5˚C after Zeroing correction. Slow measurement speed. Refer to Operation Manual for detail
measurement accuracy descriptions.
Note*2 : Measurement time includes sampling, calculation and judge test parameter measurement.
Note*3 : Not include temp. sensor accuracy
All specifications are subject to change without notice.
Component Test Scanner
Model 13001
Video &
Color
A130007
40
80
DC 500V
AC 10V
DC 1000mA
AC 100mA
PXI Test &
Measurement
12-22
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Temperature: 0˚C ~ 45˚C, Humidity: 15% to 80% [email protected]≦ 40˚C
150VA Max. (with rated load)
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
310 x 440 x 573 mm / 12.2 x 17.32 x 22.56 inch
21 kg / 46.26 lbs (13001 main frame only, without module)
Semiconductor/
IC
Max. Current without switch
13001 (MASTER & SLAVE)
SCAN
RS-232 , USB , GPIB
Electrical
Safety
Max. voltage without switch
A130007 : 40 Channels Scan Module
Power
Battery Test &
Passive
Electronics Automation Component
MODULE SPECIFICATIONS
Module
Channel
Port
Automated
Optical Inspection
SPECIFICATIONS
Model
Mode
Interface (Master only)
General
Operation Environment
Power Consumption
Power Requirements
Dimension (H x W x D)
Weight
Photovoltaic Test
& Automation
Chroma 13001 can be installed in Chroma 8800
Component ATE for DUT which a lot of procedures
to test like RJ-45 equipment, glass substrate,
LCD glass substrate, printed circuit glass, PCB,
EMI filter ICT application. The 8800 ATS can save
the manpower cost, reduce the mistake, data
management to improve quality and efficiency.
ORDERING INFORMATION
13001 : Component Test Scanner
13001 : Component Test Scanner (Slave)
A130000 : 6 BNC Test Lead
A130001 : 4 BNC Test Lead
A130002 : IR Test Lead
A130005 : Long Test Lead
A130007 : 40 Channels Scan Module
Optical
Devices
KEY FEATURES
■ Support component test scanning
■ Support 8 slots for plug-in (removable), up to
320 channels for one unit
■ Option A130007 40 channels scan module,
input up to 500VDC for IR test without
switching
■ Max. 8 salve units for multiple scanner
(master/slave interface)
■ Support Chroma LCR meter
■ Support Chroma 3302/3252/11025 turn ration
function
■ Support 11200 CLC/IR meter for IR test
■ Standard RS-232, GPIB and USB interface
■ 13001 can be installed in Chroma Component
ATE model 8800
■ Support ICT applications
Chroma 13001 can perform switch and scan test
for L, C, R etc measurement combine with LCR
Meter (Chroma model 3302/3252/11022/11025)
include turn ration if the model has and IR test
combine with Chroma 11200 CLC/IR Meter. It
also offers short function for leakage inductance
measurement. One unit could plug-in modules up
to 8 slots. It is up to 320 channels for one unit if
combined with 8 of option A1130007 40 channels
module. It provides master and slave designed
and up to 8 salve units for multiple scanner. User
can control the output test circuit through RS-232,
GPIB or USB interface.
Flat Panel
LED/
Display Lighting
I n t h e r e c e n t y e a r s, c o m p o n e n t i s m o r e
complicated and more multiple. It makes all tests
be performed which are very complicated and
different. The problem is not only the course is
complicated and apt to make mistakes, but also
the manpower cost more.
Magnetic Component Test System
Model 1810
Magnetic component's heat comes from copper
loss and iron loss. The copper loss caused by
flowing current and wire resistance. The iron
loss including Hysteresis Loss and Eddy Current
Loss, mainly comes out from AC current. The
inductance of magnetic component will drop
unexpectedly if the temperature gets too high.
Chroma 1810 is a test system for detecting the
power loss of magnetic component. It provides
DC current and AC voltage to the component,
and it has a temperature sensor detects the
temperature on component. The analysis reports
will record the result in computer by using test
program. These statistic analysis reports are
important for researching and quality control
department.
KEY FEATURES
■ Sine Wave Voltage :
20kHz~1MHz
20kHz~500kHz
■ 60A max DC Bias Current
■ Power Loss Detection
■ Temperature Detection
■ Statistic Report with Software Control
■ Customized test module
ORDERING INFORMATION
1810 : Magnetic Component Test System
HF AC Tester : Refer to Chroma Model
11802, 11803
DC Source : Refer to Chroma Model
62012P-80-60
Thermal/Multi-Function Data Logger :
Refer to Chroma Model 51101-8
A118016 : H.F. Voltage Step-up Module
- 250V/2A max.
A118019 : H.F. Current Step-up Module
- 16V/30A max.
A118037 : H.F. Current Step-up Module
- 30V/25A max.
Oscilloscope : Tektronix TDS3012C
A118037 : H.F. Current Step-up Module
Test program
Load Current (ldc) and AC Voltage (Vac) Curve
12-23
All specifications are subject to change without notice.
Capacitor Test System
Model 1820
Video &
Color
Photovoltaic Test
& Automation
Automated
Optical Inspection
ORDERING INFORMATION
Electrical
Safety
1820 : Capacitor Test System
11805 : Programmable HF AC Tester
11200 : Capacitor Leakage Current/IR Meter 800V
51101-8 : Thermal/Multi-function Data Logger 8ch
A118015 : HF Current Step-up Module
33V/30A max.
A118018 : HF Voltage Step-up Module
1kV/1A max.
A118034 : HF Voltage Step-up Module
2.5kV/400mA max.
Glassman : HV DC Power Supply 5kV
Power
Battery Test &
Passive
Electronics Automation Component
Semiconductor/
IC
By the function design of the software, Chroma
1820 can not only do the long-time temperature
rising test based on users' setting test condition,
but also increase or decrease the AC current
and switch the test frequenc y by produc t
temperature rising situation for evaluating the
maximum withstanding current under different
application frequencies. Whatever characteristic
improvement and evaluation for product research
& development, or quality verification and
check for IQC, Chroma 1820 is the best platform
to analyze the endurance and reliability of
capacitors.
Softpanel
Optical
Devices
KEY FEATURES
■ High frequency sine wave current :
1kHz~20kHz
10kHz~200kHz
■ DC bias voltage : 5000V max.
■ Capacitor endurance & temperature
rising test
■ Capacitor withstanding current test
(frequency sweep)
■ Support with software control
■ Customized test module
Chroma 1820 ia able to provide the test condition
of adding high frequency AC current on DC high
voltage that DC bias voltage can up to 5kV and AC
current frequency is from 1kHz to 20kHz / 10kHz
to 200kHz with 1kVA / 2kVA maximum output
power. It measures the multi-point temperature
accurately by 8-channel temperature data logger.
In addition to the standard test modules available
for choosing, we also provide the customized
module evaluation and design service for the
requirements of mass current test applications.
The control software specially developed for this
system can set the test conditions, record the
test data, provide the test report, and reflect the
change of temperature rising by showing the
real-time temperature curve.
Flat Panel
LED/
Display Lighting
By higher withstanding voltage and lower ESR
than electrolytic capacitors, the superior load
life characteristic of film capacitors are suitable
to be applied mainly in green energy industries
such as Photovoltaic, Elec tric Vehicle, and
wind power. When applying on circuits, high
frequency large current may rise up capacitors'
temperature and reduce their usable life. If the
current withstanding and heat dissipation are not
well-structured in the internal circuit, capacitors
can even be burned. Therefore, observe the
temperature rising characteristic under actual
working condition is the best way to evaluate the
endurance and reliability of film capacitors. It is
also the verification and analysis capabilities that
the capacitor manufacturers must have.
PXI Test &
Measurement
12-24
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Inductor Test & Packing Machine
Model 1870D Series
The Chroma 1870D Series (1870D/1870D-12) are
specifically designed automated test equipment
for wafer-type power inductors. It comprises
various test functions that are required for
ver ifying wafer-t ype power induc tors. I n
addition, an automated tape packaging machine
at the end of production line is equipped to fulfill
demand for automated manufacturing.
The standard test functions of Chroma 1870D
series are inductance (Ls)/quality factor (Q),
winding resistance(RDC) measurements and
polarity tests, along with optional layer short
(IWT), insulation resistance (IR) and BIAS current
tests that cover all test items for measuring
wafer-type power inductor quality and standard
specifications.
KEY FEATURES
■ Test and packing speeds from 80ppm
to1,800ppm
■ Standard functions
- Inductance/quality factor test
- Winding resistance test
- Polarity test
■ Optional functions
- Layer short test
- Insulation resistance test
- Bias current test
■ Circular vibrating plate design feeds
inductors steadily and rapidly
■ Index disc design eliminates dropped
inductors
■ Four-wire measurement test socket design
■ Automatic discharge mechanism when
feeding errors occur
■ Each test station has an independent NG
(No Good) product collection box
■ Test without packaging function provided,
good products gathered in bulk collection
box
■ Exclusive data collection software designed
for monitoring product quality in real time
■ Reserved stations for number spraying and
automatic optical inspection
■ Switchable Chinese/English/Japanese
operating interface
■ Equipment is fast, stable and safe
APPLICATIONS
■ Batch verification for RD and QA
■ Fully functional electrical characteristics tests
for production line
■ Nominal value for production line fast testing
■ System reserved space for marking and
optical inspection of marks
As miniature inductors are widely used in the
electronic products today, mass production of
power inductors is necessary. The production
capacity of Chroma 1870D/1870D-12 is up
to 1,800 ppm, which can satisfy the quantity
demanded. Besides testing, the 1870D/1870D-12
is also equipped with an automated packaging
m a c h i n e to t a p e a n d p a c k t h e i n d u c to r s
mechanically in order to meet the desired style of
SMD production lines.
The Chroma 1870D/1870D-12 uses a circular
vibrating plate that carries thin products at high
speed for feeding. The circular vibrating plate
uses a guide rail design, fiber detection and blow
hole to determine the feed direction. This is fast
and space saving when compared to traditional
linear reciprocating mechanical feeders.
W h e n m o v i n g i n d u c t o r s fo r t e s t i n g, t h e
t r a d i t i o n a l r e c i p r o c a t i n g o r t u r r e t-t y p e
mechanical structure uses a nozzle to attract
the inductor for movement, and the product
often drops due to inertial effects or inaccurate
positioning making it unable to test. The Chroma
1870D/1870D-12 uses an index disc design
for testing, so that the equipment is within a
closed architecture that can eliminate dropped
inductors during high-speed movement. It is
faster and more stable when compared to the
*traditional mechanical structure.
Device Features
■ Circular vibrating plate for feeding
■ Auto discharge when encountering a feed
error
■ Movement of index disc
- Closed space design for index disc without
dropping any inductors
- Fixed space easy for contact
- Stable high-speed transfer
■ Polarity test and direction reverse
■ Four-wire measurement design of test socket
■ Stable and long life span for specific test piece
■ Independent NG (No Good) product
collection box for each station
■ Heat-seal module
Feeding fiber detector
Heat-seal module
Chroma ATE Inc. not only specializes in electronic
testing technology but are also masters in fixture
design for automated test equipment. The test
socket used by the Chroma 1870D/1870D-12
test station is a four-wire measurement design
that is more accurate and stable than common
automatic test equipment. The chip design
applied to the connection of the test socket
and inductor is easier to contact and has longer
product life compared to a probe in use. The chip
design is also more stable and easier to maintain
than a probe.
The Chroma 1870D/1870D-12 has exclusive
software for monitoring test status during
p r o d u c t i o n i n r e a l t i m e, a n d s a v i n g t h e
collected test data for each inductor. Real-time
monitoring functions can benefit the production
unit by reducing the production risk during
manufacturing and cut down unnec essar y
12-25
working hours. The data collection function
is favorable to R&D and QA units for product
analysis and quality control.
1870D-12
All specifications are subject to change without notice.
Inductor Test & Packing Machine
Model 1870D Series
Video &
Color
Graphic User Interface
Flat Panel
LED/
Display Lighting
Test monitoring window
Optical
Devices
Parameter setting window
Basic information query widow
4
3
Parts feeder
5
Index DISC
Photovoltaic Test
& Automation
1870D / 1870D-12 Configuration Diagram and Stations Depiction
6
7
2
1
9
10
12
11
A
B
Heat-seal
module
* Choose one from three alternatives to work with installation testing
for the 4th station
2.5 x 2.0
1.0
800
1,200
1.0
800
1,500
Unit : pcs/min
1.6 x 0.8
0.8
0.6
800
1,200
1,500
1,800
8.0x8.0
150
10.0x10.0
100
Unit : pcs/min
12.0x12.0
80
PXI Test &
Measurement
1870D-12 Application Size Maximum Productivity
W x D (mm)
4.0x4.0
6.0x6.0
Single-sided electrode
250
200
Semiconductor/
IC
* The maximum productivity listed above does not include layer short testing, insulation resistance testing, or bias current testing.
* Production efficiency >1,200 pcs/min with paper tape used for packing. Do not use plastic tape.
* Above is the using efficiency of single size. Additional assessment is required for different size.
* Above maximum production efficiency does not include IWT test, IR test and BIAS I test.
* Above is the using efficiency of single size. Additional assessment is required for different size.
Single phase 220V, frequency 50 Hz / 2.0kW
CDA pressure 5~6 kg/cm2 ; CDA flow: 150~200 L/min
8~38℃ ; < 70%RH
approx. 450 kgs
1192 x 1660 x 1000 mm
ORDERING INFORMATION
1870D : Inductor Test & Packing Machine
1870D-12 : Inductor Test & Packing Machine
11025 : LCR Meter
11050 Series : HF LCR Meter
11200 : Capacitor Leakage Current/IR Meter
11300 : Bias Current Test System
16502 : Milliohm Meter
19301A : Impulse Winding Tester
3302 : Automatic Transformer Test System
All specifications are subject to change without notice.
12-26
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
General Specications
Power requirement
Air pressure system
Operating environment
Weight
Dimension (W x H x D)
Electrical
Safety
1.2
800
1,200
2.0 x 1.6 / 2.0 x 1.2
1.2
1.0
0.8
800
800
1,000
1,500
1,500
1,500
Power
Battery Test &
Passive
Electronics Automation Component
9. NG inductor discharge for station 8
10. Good inductor receiver
11. Move to packing tape
12. Clean remaining inductors
A. Reserved for number spraying station
B. Reserved for automatic optical inspection station
Stations
1. Feeding detect
2. Polarity test
3. Polarity reverse
* 4. Layer short test (works with 19301A)
Insulation resistance test (works with 11200)
Bias current test (works with 11300)
5. NG inductor discharge for station 4
6. Winding resistance test (works with 16502)
7. NG inductor discharge for station 6
8. Inductor/quality factor test (works 11050 Series /3302)
1870D Application Size Maximum Productivity
W x D (mm)
3.2 x 2.5
H (mm)
1.2
1.0
Single-sided electrode
600
600
Five-sided electrodes
900
900
Automated
Optical Inspection
8
Inductor Layer Short Automatic Test Machine
Model 1871
The Chroma 1871 is an automatic test system
specifically designed for chip inductors in testing
layer short for mass production applications.
This system inherits all judgment functions from
the Chroma 19301A impulse winding tester
including Area, Laplacian, and two new test
functions -ΔPeak Ratio and ΔResonant Area.
As miniature inductors are widely used in the
electronic products today, mass production of
power inductors is necessary. The production
capacity of Chroma 1871 is up to 1,500ppm,
which can satisfy the quantity demanded. It uses
5 layer short test stations to conduct the testing
at one time for fast production. Alternatively, it
can select 2 layer short test stations for R&D or
QA unit use to run in a cost-effective way.
KEY FEATURES
■ Applicable size 3.2mm x 2.5mm to
1.6mm x 0.8mm
■ Test and packing speeds from 600ppm
to 1500ppm
■ Layer short judgment functions:
- Area
- Laplacian
-ΔPeak Ratio
-ΔResonant Area
■ Equipped with contact check function to
extend the fixture lifespan.
■ Provides 2 or 5 test stations for ATS
selections based on testing requirements.
■ Index disc design eliminates dropped
inductors
■ Four-wire measurement test socket design.
■ Each test station has an independent NG
(No Good) product collection box.
■ Exclusive data collection software
designed for monitoring product quality
in real time
■ Switchable Chinese/English/Japanese
operating interface
■ Equipment is fast, stable and safe
APPLICATIONS
■ Two layer short test stations for RD and QA
batch verification
■ Five layer short test stations for high-speed
production line
The Chroma 1871 uses a circular vibrating
plate that carries thin products at high speed
for feeding. The circular vibrating plate uses a
guide rail design, fiber detection and blow hole
to determine the feed direction. This is fast and
space saving when compared to traditional linear
reciprocating mechanical feeders.
W h e n m o v i n g i n d u c t o r s fo r t e s t i n g, t h e
t r a d i t i o n a l r e c i p r o c a t i n g o r t u r r e t-t y p e
mechanical structure uses a nozzle to attract
the inductor for movement, and the product
often drops due to inertial effects or inaccurate
positioning making it unable to test. The Chroma
1871 uses an index disc design for testing, so that
the equipment is within a closed architecture
that can eliminate dropped inductors during
high-speed movement. It is faster and more
stable when compared to the traditional
mechanical structure.
Device Features
■ Circular vibrating plate for feeding
■ Movement of index disc
- Closed space design for index disc without
dropping any inductors
- Fixed space easy for contact
- Stable high-speed transfer
■ Five layer short test stations for parallel
testing
■ Four-wire measurement design of test socket
■ Impulse Winding Tester Model 19301A
- Test application 0.1μH~100μH
- Impulse voltage 10V~1000V
- <18ms high speed test
- Impulse testing sampling rate (200MHz),
10 bits
- Inductance contact check function
- Voltage compensation function for
differential inductance
- Breakdown Voltage Analysis (BDV)
- USB waveform storage and screen capture
function
■ Stable and long life span for specific test piece
■ Independent NG (No Good) product
collection box for each station
Closed space design for index disc
Chroma ATE Inc. not only specializes in electronic
testing technology but also masters in fixture
design for automated test equipment. The test
socket used by the Chroma 1871 is a four-wire
measurement design that is more accurate and
stable than common automatic test equipment.
The chip design applied to the connection of the
test socket and inductor is easier to contact and
has longer product life compared to a probe in
use.
The Chroma 1871 has exclusive software for
monitoring test status during production in
real time, and saving the collected test data for
each inductor. Real-time monitoring functions
can benefit the production unit by reducing
the production risk during manufacturing and
cut down unnecessary working hours. The data
collection function is favorable to R&D and QA
units for product analysis and quality control. The
software can perform data analysis to improve
the product quality and increase profit.
Five layer short test stations
Impulse Winding Tester Model 19301A
12-27
All specifications are subject to change without notice.
Inductor Layer Short Automatic Test Machine
Model 1871
Video &
Color
Graphic User Interface
Flat Panel
LED/
Display Lighting
Optical
Devices
Control chart query window
Test monitoring window
Control limits calculated by tested data
Photovoltaic Test
& Automation
1871 Configuration Diagram and Station Depiction
4
3
5
Index DISC
2
6
10
7
9
8
* Layer short test stations 3 to 5 are reserved when 2 stations are selected.
2.5 x 2.0
1.2
800
1,200
1.0
800
1,200
2.0 x 1.6 / 2.0 x 1.2
1.2
1.0
0.8
800
800
800
1,500
1,500
1,500
1.0
800
1,500
Unit : pcs/min
1.6 x 0.8
0.8
0.6
800
800
1,500
1,500
* The maximum productivity listed above does not include layer short testing, insulation resistance testing, or bias current testing.
Semiconductor/
IC
Single phase 220V ; frequency 60 Hz / 2.0kW
CDA Pressure 5~6 kg/cm2,CDA Flow150~200 L/min
8~38℃,< 70%RH
Approx. 500 kg
W 1280 x H 1495 x D 900 mm
PXI Test &
Measurement
General Specifications
Power requirement
Air pressure system
Operating environment
Weight
Dimension (W x H x D)
ORDERING INFORMATION
12-28
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
1871 : Inductor Layer Short ATS
19301A : Impulse Winding Tester
A187100 : 1871 Data collection software
All specifications are subject to change without notice.
Electrical
Safety
1871 Application Size Maximum Productivity
WxD(mm)
3.2 x 2.5
H(mm)
1.2
1.0
Single-sided electrode
600
600
Five-sided electrodes
900
900
Power
Battery Test &
Passive
Electronics Automation Component
1
11
Automated
Optical Inspection
Parts feeder
Stations
1. Feeding detect
2. Layer short test station 1 (works with 19301A)
3. Layer short test station 2 (works with 19301A)
4. Layer short test station 3 (works with 19301A)
5. Layer short test station 4 (works with 19301A)
6. Layer short test station 5 (works with 19301A)
7. Area NG inductor discharge
8. Laplacian NG inductor discharge
9. Contact check NG inductor discharge
10. Good inductor receiver
11. Clean remaining inductors
Component ATS
Model 8800
In recent years, as components become more
complicated and multi-channel along with
other complex problems, the cost of tests has
skyrocketed for manufacturers. Chroma 8800
component automatic test system (ATS) is
developed to effectively help manufacturers
reduce the test cost and product risk. This system
is able to complete all measurements and tests
in one single test program. This powerful feature
save time and reduce human operation errors
that decrease the enterprise risk due to improper
tests. The employment of open architecture
software provides users a flexible, powerful and
cost-effective automated test system that is
deemed the best solution for component tests.
ORDERING INFORMATION
8800: Component Automatic Test System
LCR Meter : Refer to Model 11022 / 11025 / 3302 /
3252 series
Scanner : Refer to Model 13001 series
Scan Module : Refer to Model A130007 series
IR Meter : Refer to Model 11200 series
A800005 : PCI BUS GPIB Card (National Instrument)
Chroma 8800 component automatic test system
integrates different test instruments in the system
based on test requirements. The open architecture
software offers corresponding solutions by various
test programs and products that give customers
highly flexible test combinations. In addition, user
expandable test items are provided for editing if
new requirements arise.
KEY FEATURES
■ Open architecture software
- Expandable hardware support
- Support instruments equipped with
GPIB/RS-232 or RS485 interface
- User editable test library (test Items)
- User editable test programs
- Statistical report
- User privilege control
- Test item/ program release control
- Activity log
- Support barcode reader
■ Test command editor helps to improve test
speed
■ Comprehensive hardware modules provide
highly accurate, repetitive measurements
■ High test throughput by system test items
■ High test throughput generated by system test
items
■ Cost effective
■ Hardware expandable upon request
■ Windows ® 2000/ XP based software
* Test items can be customized or created via the
test item editor based on the requirements of
various UUTs.
APPLICATIONS
■ RJ-45 equipment (including LAN modules,
Ethernet IC, PoE IC) test
■ Glass substrate test (including solar panel)
■ LCD glass substrate test
■ Printed circuit glass (including touch panel) test
■ PCB test
■ EMI filter test
■ Rechargeable battery test
■ ICT applications
12-29
This automatic test system uses a unique test
command optimization technology to prevent
the repetitive control commands from sending
to the system hardware devices. This technology
improves the system test speed dramatically.
Users create new test items based on their
requirements using the test item editor. The users
can expand the test items as needed.
T h e s y s t e m' s i n t e g r a t e d s t a t i s t i c a l a n d
management functions generate various test
statistical repor ts and per forming system
administration. Statistical repor ts are ver y
important in factories for research and design (R/
D) evaluation, quality assurance (QA) verification
and production tests. Chroma 8800's Window
2000/XP environments provide test engineers
with a dedicated components automatic test
system in a familiar Windows environment
and allows accesses to resources provided by
Windows.
Chroma 8800 component automatic test system
can combine different testers and hardware
according to the test requirements. For instance,
Chroma 13001 performs multi-channel scan test
for inductance, capacitance and resistance along
with turn ration (if applicable) measurements
when combining with the LCR Meters like Chroma
3302/3252/11022/11025. The 8800 can do IR
test as well as leakage inductance measurement
that is designed specially for short-circuit when
combining with Chroma 11200 CLC/IR Meter.
Chroma 13001 Component Test Scanner supports
up to 320 channels per unit when 8 optional
A1130007 40-channel scan modules are installed.
Up to 8 slaves of Chroma 13001 can be expanded
externally for an 8800 component ATS and up
to 2880 channels (1 master plus 8 slaves) can be
tested to fulfill the requirements for multi-channel
tests.
All specifications are subject to change without notice.
Component ATS
Model 8800
Video &
Color
SPECIFICATIONS
Accurate and highly reliable hardware devices :
11022
L,C, R,|Z|, Q, D, ESR, X,θ
10 mV~1V, step 10 mV; ±(10% + 3 mV)
50Hz, 60Hz, 100Hz, 120Hz,
1kHz, 10kHz, 20kHz, 40kHz,
50kHz, 100kHz ; 0.01%
Frequency
0.001pF~1.9999F
0.001µH~99.99kH
0.01m~99.99MΩ
0.0001~9999
-180.00˚~ +180.00˚
±0.1%
21ms
Automated
Optical Inspection
Measurement Display Range
C (Capacitance)
L, M, L2 (Inductance)
Z (Impedance), ESR
Q (Quality Factor)
D (Distortion Factor)
θ(Phase Angle)
Measurement Accuracy *1
Measurement Time (Fast) *2
Photovoltaic Test
& Automation
Note*1 : 23 ± 5˚C after OPEN and SHORT correction. Slow measurement
speed. Refer to Operation Manual for detail measurement accuracy
descriptions.
Note*2 : Measurement time includes sampling, calculation and judge of
primary and secondary test parameter measurement
Component Test Scanner
Model
Mode
Interface (Master only)
General
Operation Environment
Power Consumption
Power Requirements
Weight
Size(WxHxD)
13001 (MASTER & SLAVE)
SCAN
RS-232 , USB , GPIB
Temperature: 0˚C ~ 45˚C,
Humidity: 15% to 80% [email protected]≦ 40˚C
150VA Max. (with rated load)
90 ~ 132Vac or 180 ~ 264Vac, 47 ~ 63Hz
Approx.20Kg
(13001 main frame only, without module)
About 430mm x 311mm x 570mm
A130007
40
80
DC 500V
AC 10V
DC 1000mA
AC 100mA
Electrical
Safety
Semiconductor/
IC
Module
Channel
Port
Max. voltage without
switch
Max. Current without
switch
Power
Battery Test &
Passive
Electronics Automation Component
Capacitor Leakage Current/ IR Meter
Model
11200 (650V)
Main Function
Capacitor Leakage Current / IR Meter
Test Parameter
LC, IR
Test Signals Information
1.0 V~100 V, step 0.1 V; 101V~650 V,
Voltage
step 1V; ±( 0.5% + 0.2V)
V ≤ 100V: 0.5mA~500mA
Charge Current Limit
V > 100V: 0.5mA~150mA, 65W max.
step 0.5mA; ±( 3% + 0.05mA)
Measurement Display Range
LC : 0.001µA~20.00mA
Basic Measurement Accuracy
LC Reading : ±(0.3% + 0.005µA)
*1
Measurement
Fast
77 ms
speed
Medium
143 ms
(Ext. Trigger, Hold
Range,
Slow
420 ms
Line Frequency
60Hz)
Function
Correction
Null zeroing
Vm: 0.0 V~660.0V;
Test Voltage Monitor
±(0.2% of reading + 0.1V)
Charge Timer
0~999 sec.
Dwell Timer
0.2~999 sec.
Note*1 : 23 ± 5˚C after Null correction. Refer to Operation Manual for
detail measurement accuracy descriptions.
LCR Meter
Model
Test Parameter
Test Signals
Level
PXI Test &
Measurement
Other hardware devices :
■ Digital Multimeter (Chroma 12061 / Agilent-34401A / Keithley 2000), other types or brands of DMM supported upon request
■ Digital Storage Oscilloscope (TDS-3000 / 5000 / 7000 series), other types or brands of DSO supported upon request
12-30
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Optical
Devices
PC/IPC
Pentium III 600 or faster
256KB
128MB or higher
2.1GB or higher
24X or faster
15''
101 keys
Mouse/Print port
GPIB/RS-232
NI-PCI GPIB Card
Flat Panel
LED/
Display Lighting
System Controller
Model
CPU
SRAM
DRAM
Hard drive
CD-ROM
Monitor
Keyboard
I/O
System Interface
GPIB board
EDLC ATS
Model 8801
The Chroma Electrical Double Layer Capacitor
Au to m ati c Te s t Sy s te m m o d e l 8801 is th e
ultimate solution for EDLC (electrical double
layer capacitor) testing. The system includes a
various range of hardware choice such as DC
Sources, Electronic Loads, Timing Analyzer and
LCR Meter. This flexibility combined with its open
architecture software platform gives users a
flexible, powerful and cost effective test system
for almost all range of EDLC.
KEY FEATURES
■ Suit for electrical double layer capacitor
production line automatic test, test parameter
includes Static Capacitance
and Internal Resistance (IR and ESR)
(for EIAJ RC-2377 Test Method of Electrical
Double Layer Capacitor)
■ Open architecture software
- Expandable hardware support
- Support GPIB instruments&RS-232/RS485
interface
- User editable test library
- User editable test programs
- Statistic report
- User authority control
- Release control
- Activity log
- Multi-UUT test capability for single-output
PSU
- Support barcode reader
■ Measurement function: C/ IR / ESR
(For EIAJ RC-2377)
■ High test throughput
■ Synchronized measurement in multi-channel
reduce the test time
■ One DC source and one DC load design
■ Hardware protect circuit
■ Microsoft® Word based evaluation report or
UUT characterization
■ Cost effective
■ Other hardware expandable upon request
■ Windows® 2000/ XP based software
12-31
ORDERING INFORMATION
8801 : EDLC Automatic Test System
80611N : Timing/Noise module
5004ATM : System Controller
A880100 : EDLC 10 Channels C/IR Scanner
A800005 : PCI BUS GPIB Card
(National Instrument)
DC Load Module : Refer to Model 6330A Series
DC Source : Refer to Model 62000P Series
LCR Meter : Refer to Model 11022
The Chroma 8801 EDLC ATS uses a unique test
command optimization technology to prevent
repetitive control commands from being sent to
the system hardware devices. This improve test
speed dramatically and makes the Chroma 8801
an ideal choice for both high speed production
applications as well as design verification.
T h e C h r o m a 8 8 01 E D L C AT S i n c l u d e s a
sophisticated test executive which includes
pre-written test items for standard EIAJ RC-2377
EDLC tests. User may also create new test items
by using a special test item editing function,
which users the capability to expand the test
library unlimitedly.
This open architecture software also includes
statistic and management functions, making
the system capable to generate various
test documents and per forming system
administration. Because the statistical reports are
critically important in modern factories for R/D
evaluation, QA verification and production tests,
these functions are an integral part of the system.
Working under Window 2000/XP the model
8801 provides test engineers with a dedicated
EDLC test system in an easy-to-learn Windows
environment and allow access to resources
provided by Windows.
This auto test system uses the unique test
command optimization technology to prevent
the repeating control commands from sending
to the system hardware devices. This improves
the system test speed dramatically and makes
C h r o m a 8801, w h i c h u s e s o p e n s o f t w a r e
architecture, but still highly efficient as optimized
auto test system.
All specifications are subject to change without notice.
EDLC ATS
Model 8801
Video &
Color
SPECIFICATIONS
Accurate and highly reliable hardware devices :
0.0001~9999
-180.00˚~ +180.00˚
±0.1%
21ms
6330A Series
CC/CR/CV
30-1200W
1-500V
Up to 240A
Up to 10A/µs
Voltage/Current
No
Power
Battery Test &
Passive
Electronics Automation Component
0.001pF~1.9999F
0.001µH~99.99kH
0.01m~99.99MΩ
Electronic Load
MODEL
Load mode
Power rating
Voltage range
Current range
Slew rate
Measurements
Monitoring output
Current share
measurement
Noise measurement
Voltage sense input
Sync dynamic
Automated
Optical Inspection
Measurement Display Range
C (Capacitance)
L, M, L2 (Inductance)
Z (Impedance), ESR
Q (Quality Factor)
D (Distortion Factor)
θ(Phase Angle)
Measurement Accuracy *1
Measurement Time (Fast) *2
10 mV~1V, step 10 mV; ±(10% + 3 mV)
50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz,
20kHz, 40kHz, 50kHz, 100kHz ; 0.01%
80611
Up to 10
2V/0.4V
Up to 20MHz
Differential input
0-64 second
6 sets
4 Input module
16 output / 16 input
8
10
1 for DMM
Photovoltaic Test
& Automation
Frequency
11022
L,C, R,|Z|, Q, D, ESR, X,θ
Timing/Noise Analyzer
MODEL
NO. of input module
Noise measurement range
Low Pass Filter
Input circuit
Timing range
NO. of trigger input
NO. of comparator
Controllable TTL bits
Controllable floating relay
NO. of multiplex input
NO. of multiplex output
Optical
Devices
LCR Meter
Model
Test Parameter
Test Signals
Level
PC/IPC
Pentium III 600 or faster
256kB
128MB or higher
2.1GB or higher
24X or faster
15''
101 keys
Mouse/Print port
GPIB/RS-232
NI-PCI GPIB Card
Flat Panel
LED/
Display Lighting
System Controller
MODEL
CPU
SRAM
DRAM
Hard drive
CD-ROM
Monitor
Keyboard
I/O
System Interface
GPIB board
No
No
Yes
Yes
* Please refer to respective product catalogs for detail specifications.
Electrical
Safety
DC Source
MODEL
62000P Series
600, 1200W
Power rating
0-100V/600V
Voltage range
Yes
Programmable current limit
Yes
Programmable OV point
Yes
Analog programming
Yes
Remote sensing
5V
Line-drop compensation
* Please refer to respective product catalogs for detail specifications.
12-32
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
PXI Test &
Measurement
Other hardware devices :
■ Digital Multimeter (Chroma 12061/Agilent-34401A/Keithley 2000), other types or brands of DMM supported upon request
■ Digital Storage Oscilloscope (TDS-3000/5000/7000 series), other types or brands of DSO supported upon request
Semiconductor/
IC
Note*1 : 23 ± 5˚C after OPEN and SHORT correction. Slow measurement speed. Refer to Operation Manual for detail measurement accuracy descriptions.
Note*2 : Measurement time includes sampling, calculation and judge of primary and secondary test parameter measurement
EDLC LC Monitoring System
Model 8802
voltage alterable affection and increasing charge
full voltage time. It offers 1A maximum charge
/ discharge per channel. The box offers leakage
current GO/NG indications in front panel for each
channel. The leakage current GO/NG indications
will be automatic latched before enter discharge
mode. Operators are easy to see every DUT test
result for picking up pass or fail.
KEY FEATURES
■ Suit for electrical double layer capacitor
leakage current long time test
■ Test parameter includes leakage current
■ Charge / discharge current limit function
■ Voltage programmable, 0.9A maximum charge/
discharge per-channel
■ 1µA ~ 100mA, 0 ohm input resistance leakage
current meter
■ Multi-tank control capability
■ Up to 200 channels per-tank
■ Sequence timing control
■ Windows base control soft-panel
■ Leakage Current, charge current and discharge
current limit value programmable
■ Leakage current GO/NG indication on fixtures
* Detail specification could be depended by
customer requirement
The Chroma Electrical Double Layer Capacitor
Leakage Current Monitoring System model
8802 is the ultimate solution for EDLC (electrical
double layer capacitor) leakage current testing.
The system includes modular monitoring boxes,
and a control software to offer friend and flexible
setup and multi-tank control, and a high power
switching-mode rectifier (SMR) power supply. The
design is adaptable for long time of EDLC leakage
current test and huge amount of EDLC.
The System includes Windows® base control
soft-panel. The soft-panel has multi-tank control
capability. It offers sequence timing control
base on one tank with setup time for charge,
measurement leakage current, and discharge. The
process bar is easy for operators to see the test
process. Operators can set current limit values of
leakage current, charge current, and discharge
current through the soft-panel. The system
has 2.5V – 5.0V charge voltage programmable
capability.
The system includes a high power switchingmode rectifier (SMR) power supply. It offers a
static state charge voltage to reduce the tiny
voltage variation to speed up the leakage current
result arrive and increate the leakage current
accuracy.
Monitoring Soft-Panel
*Leakage Current Reading Value from Software
only for Reference
ORDERING INFORMATION
8802 : EDLC Leakage Current Monitoring System
A880200 : EDLC 20CH LC Monitoring Box
DC Power Supply : Refer to Model 67300 Series*
* Please refer detailed information to
Model 67300 Series
Chroma 8802 EDLC LC Monitoring System
LC Monitoring Tank
PC
USB
The System includes modular monitoring boxes.
The monitoring box offers various range of
leakage current meter from 1µA – 100mA. Each
channel has individual 0 ohm input resistance
leakage current meter. It suits the EDLC's low
internal resistance characteristic and avoid
that the meter existent effect inaccurac y
leakage current measured. The box offers three
circuits, charge, discharge and leakage current
measurement circuit. Operators can finish the
whole process in one system. Charge and leakage
current circuit have design for reducing the charge
12-33
All specifications are subject to change without notice.
EDLC LC Monitoring System
Model 8802
Video &
Color
0.1A ~ 0.9A Per Channel,
Step 0.1A; ±(10% +0.05A); 18A max Per Box
±(8% of reading +3% of range), Step 0.001mA;
±(8% of reading +3% of range), Step 0.01mA;
±(8% of reading +3% of range), Step 0.1mA;
±(8% of reading +3% of range), Step 1mA;
LED (Red Light for Fail)
Automated
Optical Inspection
Current Limit
2.5 ~ 6.0V, Step 0.1V, ±(1%)
Photovoltaic Test
& Automation
Leakage Current Judgment
Accuracy *1
Range
Normal Mode
0.11mA 0.001mA~0.109mA
1.1mA
0.11mA~1.09mA
11mA
1.1mA~10.9mA
110mA 11mA~110mA
Indication
Discharge Information
A880200
EDLC Charge / Leakage Current / Discharge Monitoring Box
Optical
Devices
Charge Current Limit
Flat Panel
LED/
Display Lighting
SPECIFICATIONS
Leakage Current Monitoring Box*
Model
Main Function
Charge Information
Charge Voltag (from DC Power
Supply 67300 Series)
0.1A ~ 0.9A Per Channel, Step 0.1A;
±(10%+0.05A); 18A max Per Box
Power
Battery Test &
Passive
Electronics Automation Component
General
Operation Environment
Temperature: 10˚C ~ 40˚C Humidity: < 90%RH
Power Consumption
1000VA max
Power Requirement
180 ~ 264Vac, 47 ~ 63Hz
Dimension (H x W x D)
131 x 428 x 613 mm / 5.16 x 16.85 x 24.13 inch
Note*1 : 23±5˚C after Null correction. Refer to the Operation Manual for detail measurement
accuracy description
*Detail specification could be depend by customer requirement
Electrical
Safety
Semiconductor/
IC
PXI Test &
Measurement
12-34
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Options of Passive Component Test Instruments
MODEL
OPTIONS
1075
11020
3250
3252
3302
3312
SMD Test Cable
●
●
●
●
●
●
●
●
●
●
●
A110211
ComponentTest Fixture
●
●
●
●
●
●
●
●
●
●
●
A110212
Component Remote Test Fixture
●
●
●
●
●
●
●
●
●
●
●
A110232
4 BNC Test Cable with Clip #18
●
●
●
●
●
●
A110234
High Frequency Test Cable
●
●
●
●
●
●
●
●
●
●
●
A110235
GPIB & Handler Card
●
A110236
19" Rack Mounting Kit
●
●
●
A110239
4 Terminals SMD Electrical CapacitorTest Box (Patent)
●
●
●
●
●
●
●
●
●
A110242
Battery ESR Test Kit
●
●
A110244
High Capacitance Capacitor Test Fixture
●
●
A110245
Ring Core Test Fixture
A110501
4 Terminals SMD Test Fixture
●
●
●
A118030
PCB for SMD Capacitor
●
●
●
A132501
Auto Transformer Scanning Box
(7.5~5mm Test Fixture)
●
●
●
●
●
●
●
●
●
●
●
●
●
A110104
11021 11022 11025 1061A 1062A
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
A132574
Test Fixture for SMD Power Choke
●
●
A133004
SMD Test Box
●
●
●
●
●
●
●
A133019
BNC Test Lead, 2M (single side open)
●
●
●
●
●
●
●
A165009
4 BNC Test Cable with Probe
●
●
●
●
MODEL
OPTIONS
1310
1320
●
11300 13100 11800 11801 11810 11200 16502
A110235
GPIB & Handler Card
●
●
A110236
19" Rack Mounting Kit
●
●
A113008
4 Terminals Test Fixture for DIP 100A
●
●
A113009
4 Terminals Test Fixture for SMD 60A
●
●
A113010
4 Terminals PCB for SMD 100A
●
●
A113011
4 Terminals Test Cable with Clip
●
●
A115001
Foot Switch #10
●
●
A118004
Series Test Fixture
●
●
●
A118005
Parallel Test Fixture
●
●
●
A118028
Series Test Fixture for Low Voltage
●
●
A118029
Series Test Fixture for Low Voltage
●
●
A118030
PCB for SMD Capacitor
●
●
A131001
10 Channels Switching Test Fixture
A165013
GPIB and Handler Interface
with Temperature Compensation
●
A165014
Temperature Compensation Card
●
A165015
PT100 Temperature Probe
●
A165016
Pin Type Leads (flat)
●
A165017
4 Channels R Scanners
●
A165018
Test Fixture for SMD Power Choke
●
A165019
Pin Type Leads (taper)
●
A165022
4 Terminals Test Cable
●
12-35
●
All specifications are subject to change without notice.
Options of Passive Component Test Instruments
Video &
Color
A110212
A110232
A110234
A110235
A110236
A110239
A110242
A110244
A110245
A110501
A113008
A113009 (with 113008)
A113010
A113011
A113012
A113014
A115001
A118004
A118005
A118028
A118029
A118030
A131001
A132501
A132574
A133019
A133004
A165009
A165013
A165014
A165015
A165016
A165017
A165018
A165019
A165022
Optical
Devices
A110211
Flat Panel
LED/
Display Lighting
A110104
Photovoltaic Test
& Automation
Automated
Optical Inspection
Power
Battery Test &
Passive
Electronics Automation Component
Electrical
Safety
Semiconductor/
IC
PXI Test &
Measurement
12-36
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Electrical Safety Test Solution
Selection Guides
13-1
Multi-function Electrical Analyzer
13-3
Hipot Tester
13-9
Impulse Winding Tester
13-14
Electrical Safety Test Scanner
13-17
Ground Bond Tester
13-19
Calibrator
13-20
Automatic Test System
13-21
Options of Electrical Safety Test Instruments
13-24
Overview
High Capacitance Electrolytic
Capacitor ATS
Multi-function
Electrical Analyzer
Calibrator
Electrical Equipment ATS
Hipot Tester
Impulse Winding Tester
Medical Electrical Safety ATS
Electrical Safety
Test Scanner
Ground Bond Tester
Selection Guides
Electrical Safety Tester Selection Guide – Main Function
AC/DC HIPOT
Model
Insulation Resistance
Ground Bond
Leakage Current
Test *1
Impulse
Winding
Test
Others
Page
10/4
channels
13-9
AC/DC
output
Cutoff
current
Flashover
Detection
DC output
Range
Current
Range
Power Capacity
19020 (CE)
5kVac
6kVdc
AC:10mA
DC:5mA
AC:20mA
DC:10mA
1kV
50GΩ
-
-
-
19032 (CE)
5kVac
6kVdc
AC:40mA
DC:12mA
AC:20mA
DC:10mA
1kV
50GΩ
30A
60A*2
510mΩ*3
300V / 20A max.*2
19032-P (CE)
5kVac
6kVdc
AC:100mA
DC:25mA
AC:20mA
DC:10mA
1kV
50GΩ
40A
510mΩ*3
300V / 20A max.*2
500VA
Floating
Output
13-3
19035 (CE)
5kVac
6kVdc
AC:30mA
DC:10mA
AC:15mA
DC:10mA
5kV
50GΩ
-
-
-
DCR
8 ports
scanner
13-5
19036 (CE)
5kVac
6kVdc
AC:100mA
DC:25mA
AC:20mA
DC:10mA
5kV
50GΩ
-
-
-
10 ports
scanner
13-7
19052
(CE,TUV, UL)
5kVac
6kVdc
AC:30mA
DC:10mA
AC:15mA
DC:10mA
1kV
50GΩ
-
-
-
19053 (CE)
5kVac
6kVdc
AC:30mA
DC:10mA
AC:15mA
DC:10mA
1kV
10GΩ
-
-
-
8 ports
scanner
13-10
19054
(CE,TUV, UL)
5kVac
6kVdc
AC:30mA
DC:10mA
AC:15mA
DC:10mA
1kV
10GΩ
-
-
-
4 ports
scanner
13-10
19055 (CE)
5kVac
6kVdc
AC:100mA
DC:25mA
AC:20mA
DC:10mA
5kV
50GΩ
-
-
-
500VA
Floating
Output,
corona
detection
13-11
19056 (CE)
10kVac
AC:20mA
20mA
-
-
-
-
-
19057 (CE)
12kVdc
DC:10mA
10mA
5kV
50GΩ
-
-
-
13-12
19057-20 (CE)
20kVdc
DC:5mA
10mA
5kV
50GΩ
-
-
-
13-12
19071
(CE,TUV, UL)
5kVac
AC:20mA
AC:15mA
-
-
-
-
-
19073
(CE,TUV, UL)
5kVac
6kVdc
AC:20mA
DC:5mA
AC:15mA
DC:5mA
1kV
50GΩ
-
-
-
13-3
6kV
13-10
13-12
AC only
13-13
13-13
19301A (CE)
1kV
0.1µH min. 13-14
19305 (CE)
6kV
10µH min.
13-16
6kV
10 ports
scanner
13-16
19305-10 (CE)
45A
510mΩ*3
19572 (CE)
Note *1 : Leakage current Test is required by standards of Electrical Appliances, Medical Equipment, IT products, and Video/Audio Appliances etc.
(IEC 60065, 60335, 60601, 60950 etc.)
Note *2 : Options
Note *3 : It depends on current output
13-1
All specifications are subject to change without notice.
13-19
Electrical Safety Tester Selection Guide - Sub-Function and Remote
Sub-Function
Model
OSC
GFI
PA
GC
Smart
Start
Scan
Remote
HFCC
19020
●
●
19032
●
●
●
19032-P
●
●
●
●
19035
●
●
●
●
19036
●
●
●
●
19052
●
●
●
●
●
19053
●
●
●
●
●
19054
●
●
●
●
●
19055
●
●
●
19056
●
●
●
●
19057
●
19057-20
●
●
●
●
●
●
19073
●
●
●
●
●
HSCC
RS485
RS232
RS422
GPIB
9 pin
D-SUB
Handler
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
USB
LAN
Page
13-9
●
13-3
●
●
13-3
●
13-5
●
●
13-7
13-10
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
13-12
●
●
●
●
●
13-12
●
●
●
●
●
13-12
●
13-13
●
13-13
●
19071
HVCC
SubStep
●
●
●
●
13-10
13-10
●
13-11
●
19301A
●
●
●
●
13-14
19305
●
●
●
●
13-16
●
●
●
●
13-16
19305-10
●
●
Calibrator Selection Guide
Model
9102
Primary
Function Calibrator Level
Description
Page
Hipot Calibrator
AC 6Kv / DC 10kV / ACI/DCI 200mA / GB
32A, 100mΩ / IR 1000MΩ
For Hipot testing equipment calibration and verification
13-20
All specifications are subject to change without notice.
13-2
Electrical Safety Analyzer
KEY FEATURES
■ Floating Output Design meet EN50191
(19032-P)
■ 500VA Power Rating (19032-P)
■ Five instruments in one: AC Hipot, DC Hipot,
Insulation Resistance, Ground Bond and
Leakage Current (Option)
■ Twin-PortTM function (Patent)
■ Programmable output voltage to 5kV AC and
6kV DC
■ Insulation resistance to 50GΩ/1000V DC
■ Ground bond up to 30A (Option up to 40A /
60A)
■ Open/Short check(OSC)
■ ARC detection (Flashover)
■ Password Protected front panel lockout
■ Storage of 50 Tests Setups with 100 groups
recall
■ Optional dynamic leakage current auto
scanning (A190305/A190306/ A190308/
A190350)
■ Standard RS-232 Interface
■ Standard GB Offset KIT, SCANNER Interface
■ Optional GPIB Interface
■ Optional Bar-code Scanner
■ Optional EST software for test programming,
data mining, statistic
■ CE mark
Model 19032/19032-P
KEY FEATURES - A190308 / A190350
■ Plug in to 19032/19032-P for Hipot,
Line Leakage Auto Scan
■ Five Different Kinds Human Body RC Network
■ Four measurements mode : Normal, Reverse,
Single Fault Normal, Single Fault Reverse
■ Up to 20A Line Input Current Capability
■ Build in A/D and Calibration Data Memory Easy
to Install
■ Multiple Display Mode Voltage-LC, Amp-LC,
VA-LC
■ Earth LC, Enclosure LC, Patient LC and Patient
Auxiliary LC Test
ORDERING INFORMATION
The 19032/19032-P are 5 in 1 Production Safety
Analyzer. It can perform AC/DC Hipot, insulation
resistance, grounding resistance and dynamic
leak age current 5 safety test functions for
electronic products. The dynamic leakage current
scan device can be connected externally or built
in to 19032 Series. It is capable of measuring
the complicate safety requirements with easy
installation and operation, and is the finest auto
safety tester to increase production test efficiency.
Model 19032/19032-P have Twin-PortTM and OSC
function to minimize the test time greatly; along
with the super large screen display and intelligent
operation mode, 19032 is the most powerful
single unit for auto safety tester.
19032-P : Electrical Safety Analyzer 500VA
19032 : Electrical Safety Analyzer
A190301 : 8HV Scanning Box
A190302 : 5HV/3GC Scanner
A190303 : 3HV/5GC Scanner
A190304 : 8HV Scanner
A190305 : Line Leakage Current Scanner (generally)
A190306 : Hipot/Line Leakage/Probe Scanner (10A)
A190308 : Hipot/Line Leakage/Probe Scanner (20A)
A190313 : 500VA Isolation Transformer
A190314 : 1000VA Isolation Transformer
A190316 : Dummy Load
A190334 : Ground Bond 40A (19032)
A190336 : 8HV/8GB Scanning Box
A190337 : Ground Bond 60A (19032)
A190338 : 19001 EST Software
A190343 : 19" Rack Mounting Kit (19032)
A190344 : HV Gun
A190349 : Universal Corded Product Adapter
A190350 : HV/LC/LAC/DC Probe Scanner (20A)
A190353 : 4HV/4GC Scanner
A190355 : 19" Rack Mounting Kit (19032-P)
A190356 : GPIB Interface (19032-P)
A190508 : GPIB Interface (19032)
A190708 : ARC Verification Fixture
A
Hi-Z
19032
Floating output
INTERNAL SCANNER FUNCTION FOR MODEL 19032/19032-P
Option
Hipot
GB
Voltage
Current
No.
Name
Ports
Ports
Max.
Max.
9030A
A190301
8 ports
(Ext.)
A190336
9030AG
8 ports
8 ports
40A
A190302
6000-01
5 ports
3 ports
30A
A190303
6000-02
3 ports
5 ports
30A
A190304
6000-03
8 ports
A190353
6000-11
4 ports
4 ports
40A *1
5KVac
6KVdc
A190305
6000-04
A190306
6000-05
A190308
6000-07
A190350
6000-08
L+N to E
P to S
-
-
-
-
-
-
LC
Power
output
Reading
LC probe
Earth LC
Touch LC
Patient
LC
Patient Aux
LC
-
-
-
-
-
-
-
300V
10A
300V
10A
300V
20A
300V
20A
-
-
-
-
-
-
RMS
-
●
-
-
-
RMS
P1&P2
●
●
●
●
RMS
P1&P2
●
●
●
●
RMS &
Peak
P1&P2
●
●
●
●
Note*1 : GB Max Current 40A for Model 19032-P, and 30A for Model 19032
13-3
All specifications are subject to change without notice.
Electrical Safety Analyzer
Model 19032/19032-P
Video &
Color
SPECIFICATIONS
Support Mode
DUT Input Power
Capacity
Short Protection
Measurement Mode
A190305~A190350 *
(6000-04~08)
ACWV / DCWV / IR / LC
AC : 300V / 10A / 20A max.
20A, 250V fuse for DUT shorted.
Power
Battery Test &
Passive
Electronics Automation Component
Special Functions
A190350 (6000-08)
LC DC Measurement
U1, U2 (UL-1950)
Hot Swap
Automated
Optical Inspection
Model
Photovoltaic Test
& Automation
DC ~ 1MHz
Input Impedance : 1M//20pF
Normal, Reverse, Single Fault
Measurement Mode
Normal, Single Fault Reverse
UL 544 NP, UL 544 P, UL 1563, UL
Measurement Devices 60601-1, IEC60601-1, UL 3101-1,
(Five measure device)
UL/IEC 60950, UL 1950-U1*,
UL 2601-U1*, IEC60990
Probe Connection
Line to Ground, Line to P2, P1 to P2
HI-LO Limit
LC HI-LO Limit
0 ~ 9.99mA, 1μA resolution
Current HI-LO Limit
0 ~ 19.99Amp*
VA HI-LO Limit
0 ~ 4400VA
VA Resolution
0.1VA
*Different options have different specification
Input Characteristic
Optical
Devices
Electrical
Safety
Semiconductor/
IC
PXI Test &
Measurement
13-4
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Model
Flat Panel
LED/
Display Lighting
Model
19032
19032-P
ACWV / DCWV / IR / GB / LC
Mode
Withstanding Voltage Test
Output Voltage
DC : 0.05 ~ 6kV, AC : 0.05 ~ 5kV
Load Regulation
≦ (1% +5V)
≦ (2% of setting +0.1% of full scale)
Voltage Regulation
2V
Voltage Accuracy
±(1% of reading+0.1% of full scale) ±(2% of setting +0.1% of ull scale)
Cutoff Current
DC : 12mA , AC : 40mA
DC : 25mA , AC : 100mA
Current Resolution
0.1 µA DC ; 1 µA AC
Current Accuracy
±(1% of reading +0.2% of full scale) ±(2% of reading +0.5% of range)
Output Frequency
50Hz ~ 600Hz
Test Time
0.3 ~ 999 sec , continue
Ramp Time
0.1 ~ 999 sec, Off
Fall Time
0.1 ~ 999 sec, Off
Waveform
Sine wave
Insulation Resistance Test
Output Voltage
DC : 0.05 ~ 1kV
Voltage Resolution
2V
Voltage Accuracy ±(1% of reading + 0.5% of full scale) ±(2% of reading + 0.5% of full scale)
IR Range
0.1MΩ ~ 50GΩ
Resistance
0.1MΩ
Resolution
Resistance
5% typical
Accuracy
Ground Bond Test
Output Current
AC : 1 ~ 30A
AC : 3 ~ 40A
Current Accuracy
±(1% of setting + 1% of full scale) ±(2% of setting + 0.1% of full scale)
GR Range
10mΩ ~ 510mΩ
Resistance
0.1mΩ
Resolution
Resistance
± (1% of reading + 0.1% of full scale) ± (1% of reading + 0.1% of full scale)
Accuracy
Test Method
4 wires
Flashover Detection
Setting Mode
Programmable setting
Detection Current
AC, DC : 1~30mA
AC : 20mA, DC : 10mA
Secure Protection Function
Ground Fault
0.5mA ±0.25mA AC
Interrupt
Floating Output to
<3mA, front output only
ground
(meet EN50191)
Panel Operation
Present password
Lock
Interlock
YES
GO/NG Judgment Window
GO : Short sound,Green LED
Indication,Alarm
NG : Long sound, Red LED
Data Hold
Least tests data memories
Memory Storage
50 setups with up to 100 groups recall
Interface
Interface
9pin D-sub I/O control / RS-232 / GPIB (Optional)
General
Operation
Temperature : 0˚C ~ 40˚C, Humidity : 20 % ~ 80 % RH
Environment
No load : < 100W
Power
No load : < 100 W With
Rated load : 1000W
Consumption
rated load : 800 W
Maximum load : 1200W
Power
90~132Vac or 180~264Vac, 47~63Hz
Requirements
Dimension
133 x 430 x 470 mm /
133 x 430 x 500 mm /
(H x W x D)
5.24 x 16.93 x 18.66 inch
5.22 x 16.93 x 19.69 inch
Weight
25.5 kg / 56.17 lbs
24 kg / 52.86 lbs
Cetification
CE
CE
Wound Component EST Scanner
Model 19035
19035-M
19035-S
FUNCTIONS
■ 5KVAC & 6KV DC Hipot Test
■ 0.1MΩ~50GΩ /5kV IR Test
■ 50mΩ~100kΩ DCR Test
■ 8 Channel Scanner
KEY FEATURES
■ SUB-STEP Function
■ Open / Short Check (OSC)
■ High Speed Contact Check (HSCC)
■ Flashover Detection
■ Key Lock Function
■ RS-232 Interface (standard*1)
■ GPIB & HANDLER (optional)
■ Friendly Interface
■ CE Mark
Model 19035 Series
Wound Component Testing Solution
The quality verification test items for Wound
Component consist of AC/DC Hipot tests,
Insulation Resistance (IR) test and Impulse
Winding test. Chroma integrates above tests into
19035 Wound Component EST Scanner series
performing safety tests for motor, transformer,
heater related wound products. The wound
component manufacturers in quality verification
testing not only have reliable quality but also
control product quality efficiently.
The 19035 Series support 5kVac/6kVdc high
voltage output to conform with withstand
test requirement for Wound Component, its
maximum output current can up to 30mA.
Insulation Resistance (IR) test measurement
range is 1MΩ to 50G Ω and voltage output can
up to 5kV. DCR can measure basic specification
for Wound Component and also check the
connection before testing safety withstand.
The 19035 Series also include powerful functions
in Flashover detection and Open/ Short Check
(OSC) as well as programmable voltage, time
parameters, etc. for various DUTs features to
promote testing reliability and product quality.
Applications
The 19035 is a comprehensive safety tester
designed for motor, transformer, heater related
wound component requirements. Most of
wound components are equipped with multiple
winding such as 3-phase motor, dual winding
transformer, and etc.. The 19035 can be used to
reach multiple points completion in one test by
8-channels scanning instead of switching test
point manually. It saves test time and human
cost.
The 19035 provides OSC and DCR functions to
verify if bad contact or short circuit happened
during test procedure. It solves the Wound
Components of motor, transformer, etc occurred
contact problems, so that test quality greatly
enhanced and the life of test device prolonged.
13-5
ORDERING INFORMATION
19035 : Wound Component EST Scanner
19035-M : Wound Component EST Scanner
19035-S : Wound Component EST Scanner
A165015 : PT100 temperature probe
A190347 : GPIB & Handler & temperature interface
A190348 : RS-232 interface
A190351 : 8ch-16ch HV box for 19035
A190358 : Handler indicator
A190359 : 16ch HV external scanning box (H,L,X)
A190702 : 40KV HV test probe
A190351 : 8CH-16CH Scan Box
A190359 : 16ch HV External Scanning Box (H,L,X)
All specifications are subject to change without notice.
Wound Component EST Scanner
AC:0.05 ~ 5KV, DC : 0.05 ~ 6kV
AC:0.05 ~ 5KV
≦(1% of setting + 0.1% of full scale)
2V
±(1% of setting + 0.1% of full scale)
AC : 30mA, DC : 10mA
AC : 1μA, DC : 0.1 μA
±(1% of reading + 0.5% of range)
50Hz / 60Hz
0.3 ~ 999 sec., continue / 0.1 ~ 999 sec., off / 0.1 ~ 999 sec., off / 0.1 ~ 999 sec., off
Sine wave
------
Automated
Optical Inspection
--
--
Power
Battery Test &
Passive
Electronics Automation Component
DC : 0.05 ~ 5kV
2V
1% of setting + 0.1% of full range
0.1MΩ ~ 50GΩ
0.1MΩ
1MΩ ~ 1GΩ : ± (3% of reading + 0.1% of full range)
1GΩ ~ 10GΩ : ± (7% of reading + 2% of full range)
10GΩ ~ 50GΩ : ± (10% of reading + 1% of full range)
0.1MΩ ~ 1GΩ : ± (3% of reading + 0.1% of full range)
1GΩ ~ 10GΩ : ± (7% of reading + 2% of full range)
10GΩ ~ 50GΩ : ± (10% of reading + 1% of full range)
0.1MΩ ~ 1GΩ : ± 3% of reading + (0.2*500/Vs)% of full scale
8 ports, ±phase (4W DCR only 4 ports)
Photovoltaic Test
& Automation
--
<DC 10V. < DC 140mA
2 terminals (2W) / 4 terminals(4W) measurement selectable ; Range : 50mΩ~500kΩ
-- / ±(0.5% of reading + 0.5% of range)
± (2% of reading + 0.5% of range) / ± (0.5% of reading + 0.05% of range)
± (2% of reading + 0.5% of range) / ± (0.5% of reading + 0.05% of range)
± (2% of reading + 0.5% of range) / ± (0.5% of reading + 0.05% of range)
± (2% of reading + 0.5% of range) / ± (0.5% of reading + 0.05% of range)
± (2% of reading + 0.5% of range) / ± (0.5% of reading + 0.05% of range)
Programmable setting
AC : 1mA ~ 15mA, DC : 1mA ~ 10mA
Electrical
Safety
0.4ms after NG happen
0.5mA ±0.25mA AC, ON/OFF
Present password
YES
Semiconductor/
IC
GO : Short sound, Green LED; NG : Long sound, Red LED
Least tests data memories
50 instrument setups with up to 20 test steps
RS-232*1 (Standard), RS-232*1 or GPIB & Handler & Temperature interface (Optional)
Temperature: 0˚C ~ 45˚C, Humidity: 15% to 95% [email protected]≦40˚C
500VA
90~132Vac or 180~264Vac, 47~63Hz
133x430x470mm/5.24x16.93x18.50 inch
Approx.20 kg/44.09 lbs
13-6
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
PXI Test &
Measurement
< 500V
Scanner Unit
DC Resistance Measurement
Test Signal
Measurement mode
1Ω (4W only)
10Ω
Measurement
100Ω
Accuracy
1kΩ
(2W/ 4W)
10kΩ
100kΩ
Flashover Detection
Setting Mode
Detection Current
Secure Protection Function
Fast Output Cut-off
Ground Fault Interrupt
Panel Operation Lock
Interlock
GO/NG Judgment Window
Indication, Alarm
Data Hold
Memory Storage
Interface
General
Operation Environment
Power Consumption
Power Requirements
Dimension (H x W x D)
Weight
19035-S
ACWV / DCR - 8CH
H/L/X in 8CHs
Optical
Devices
500V~1000V
19035-M
ACWV / DCWV / IR / DCR - 8CH
H/X in CH 1,2,3,5,6,7 ; L/X in CH 4,8
Flat Panel
LED/
Display Lighting
≧1000V
Resistance
Accuracy
19035
ACWV / DCWV / IR / DCR - 8CH
H/L/X in 8CHs
Video &
Color
SPECIFICATIONS
Model
Mode
Channel Programming
Withstanding Voltage Test
Output Voltage
Load Regulation
Voltage Resolution
Voltage Accuracy
Cutoff Current
Current Resolution
Current Accuracy
Output Frequency
Test / Ramp / Fall / Dwell Time
Waveform
Insulation Resistance Test
Output Voltage
Voltage Resolution
Voltage Accuracy
IR Range
Resistance Resolution
Model 19035 Series
Wound Component EST Analyzer
Model 19036
test functions. Up to 40ch of scanning test can be
conducted when 19036 is configured with 16ch
scan box.
KEY FEATURES
■ 5 in 1 composite analyzer scanner
(ACW / DCW/ IR / IWT / DCR)
■ 5kV AC/6kV DC Hi-pot test
■ 5kV Insulation Resistance test
■ Impulse Winding Tester (IWT)
■ IWT high sampling rate(200MHz)
■ 10 channels 4-wire DCR test
■ Δ /Y motor DCR calculation
■ L/Q test with Chroma 3252/3302 (option)
■ HSCC (High Speed Contact Check)
■ Support max. 40 channels scanning test
■ Automatic data export
■ English, Traditional Chinese and
Simplified Chinese User Interface
■ USB waveform storage& Hand copy function
■ Graphic color display
■ Standard LAN,USB,RS232, HANDLER interface
■ GFI (Ground Fault Interrupter) for bod protection
Chroma 19036 is the industry's first test device
that combines the functions of impulse tester and
hipot analyzer for testing the impulse of wound
components. The tester has 5kVac/6kVdc high
voltage output and 6kV impulse voltage that can
comply with the wound components test demands
by providing maximum 10 channels output for
multichannel scanning tests to save time and labor
costs.
The quality verifications of wound components
include AC/DC hipot test, IR test and impulse
winding test. Chroma integrates the above tests
into 19036 Wound Component EST Analyzer that
can perform safety tests on wound products like
motors, transformers and heaters to verify their
quality with efficiency.
Since the poor insulation of coil often causes layer
short, cross-line short and pin short, layer short
circuit test is required for coils as the reason could
be initial design error, poor fabrication process
or bad insulation material. Moreover, the wound
components for safety tester need to be tested
with Impulse Winding Tester (IWT) to check the
insulation ability of windings. It can measure
multiple test points in one test instead of switching
test points manually.
19036 also has HSCC functions to check for any
bad contact prior test. It can solve the test fail
problems caused by motor or transformer bad
contact and improve the test quality as well as
prolong the test equipment life。
The motor test standard such as UL 1004-1
requires high power safety tester. For the user that
needs to test large leakage current or perform
large equipment electrical safety tests, Chroma
19036 that has the capability of outputting and
measuring AC 100mA/ DC 20mA with high power
hipot tests and other safety tests integrated
into one is the most suitable device to bring the
maximum benefit to production line and quality
assurance. The 500VA design is also compliant
with IEC/UL for output power requirements.
Product Applications
Rotating Motor Component: △/Y-type Motor,
Fan , Rotor/Stator
The application of motors from EV motor, server
motor to actuator motor and fan, impulse test,
hipot tests and DC resistance tests need to be
performed in the fabrication process to ensure
the product quality. The JB/T 7080 GB mechanical
industry standards and regulations are followed
for tests.
Winding of △-type and Y-type Motor
To solve the problem of unable doing DCR
measurement on the △-type and Y-type motor
winding (no center-tapped), Chroma 19036 adds
△-type and Y-type motor winding DCR calculation
function to get the value of R1,R2 and R3 directly.
40 Channels Scanning Test
A190359 scanner has 16 test channels and
e a c h o f t h e m c a n s e t t o H (h i g h v o l t a g e
o u t p u t), L (r e f e r e n c e p o i n t) o r O f f . T h e
co m b i n at i o n o f 19036 a n d A190359 c a n
apply to in small amount but diversified DUTs
o r w i t h m u l t i p l e P I N s a s we l l a s c e l l t y p e
production line to complete all test within one
station.
The DCR measurement on the 19036 can perform
four-wire test and each single endpoint can cover
Drive and Sense for 10 independent channels
to test 3 DUTs in one scan. It improves the
production capacity. Each channel can be set
to high voltage output / reference port / close
separately.
Test Items for Y-type Motor
- HSCC / OSC
- DCR Test
- Impulse Test
- Hi-pot –Sub step test
ORDERING INFORMATION
19036 : Wound Component EST Analyzer
A165015 : PT100 temperature probe
A190359 : 16ch HV External Scanning Box
A190361 : Wound Component EST Software
A190362 : 16ch 4-wire HV External Scanning Box
A190363 : 4-wire test cable with clip
A190364 : 4-wire test cable with bare wire (1.5m)
A190365 : 4-wire test cable with bare wire (3m)
Combining with impulse winding test function
the 19036 has 6kV impulse voltage, AREA SIZE
COMPARISON, DIFFERENTIAL AREA COMPARISON,
FLUTTER DETECTION, LAPLACIAN DETECTION , and
ΔPeak ratio judgment that are effective methods
for detecting poor coil insulation.
19036 is equipped with a patented 4-wire test port
that has both Drive and Sense in compliance with
hipot specification to provide 10 channels of 4-wire
13-7
All specifications are subject to change without notice.
Wound Component EST Analyzer
Video &
Color
SPECIFICATIONS
Model
AC/DC Withstanding Test
Output Voltage
Load Regulation
Voltage Accuracy
Voltage Resolution
Model 19036
19036
Flat Panel
LED/
Display Lighting
Cutoff Current
Current Accuracy
>1kV
Resistance Accuracy
OSC (open/short check)
HFCC (High Frequency Contact Check)
HSCC (High Speed Contact Check)
0.5mA ±0.25mA AC, ON/OFF
Yes (password control)
YES
GO : Short sound, Green LED; NG : Long sound, Red LED
200 sets, max. 60 steps per set
Temperature: 0℃ ~ 45℃, Humidity: 15% to 95% [email protected]≦ 40℃
No Load: <150W ; Rated Load: <1000W
90 ~ 264Vac, 47 ~ 63Hz
428 × 177 × 500mm / 16.850 x 6.969 x 19.685 inch
26kg / 57.32 lbs
13-8
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Programmable setting AC : 20mA ; DC : 10mA
PXI Test &
Measurement
Electrical Hazard Protection Function
Ground Fault Interrupt
Key Lock
Interlock
Indication, Alarm
Memory Storage
Interface
Standard : RS232, Handler ,USB , LAN interface
General
Operation Environment
Power Consumption
Power Requirements
Dimension (W ×H ×D)
Weight
<DC 10V , <DC 200mA
0.1mΩ~ 500kΩ
± (0.5% of reading + 1% of full range)
± (0.5% of reading + 0.2% of full range)
± (0.5% of reading + 0.05% of full range)
± (0.5% of reading + 0.05 % of full range)
± (0.5% of reading + 0.05 % of full range)
± (0.5% of reading + 0.05 % of full range)
± (0.5% of reading + 0.05 % of full range)
Semiconductor/
IC
Contact Check
0.1 ~ 6kV ,10V Step ,Max 0.21 Joules
More than 10uH
10bit / 5ns (200MHz)
11 Range
Pulse Number: 1~32, Dummy Pulse Number: 0~9
Area / Differential Area;Flutter/ Laplacian Detection/ΔPeak ratio
Electrical
Safety
<0.5kV
Impulse Winding Test
Applied Voltage, Step, and Energy
Inductance Test Range
Sampling Speed
Sampling Range
Pulse Number
Detection Mode
DC Resistance Measurement
Test Signal
Measurement Range
100mΩ
1Ω
10Ω
100Ω
Measurement Accuracy
1kΩ
10kΩ
100kΩ
Flashover Detection
Detection Current
Contact Check Function
Power
Battery Test &
Passive
Electronics Automation Component
≧0.5kV and ≦1kV
DC : 0.050 ~ 5.000kV, Steps:0.002kV
≦(1% of output + 0.1% of full scale)
± ( 1% of setting + 0.1% of full scale)
0.1MΩ ~ 50GΩ
1MΩ ~ 1GΩ : ± (3% of reading + 0.1% of full range)
1GΩ ~ 10GΩ : ± (7% of reading + 2% of full range )
10GΩ ~ 50GΩ : ± (10% of reading + 1% of full range)
0.1MΩ ~ 1GΩ : ± (3% of reading + 0.1% of full range)
1GΩ ~ 10GΩ : ± (7% of reading + 2% of full range )
10GΩ ~ 50GΩ : ± (10% of reading + 1% of full range)
1MΩ ~ 1GΩ : ± (5% of reading + (0.2*500/Vs)% of full scale)
Automated
Optical Inspection
Output Frequency
Waveform
Insulation Resistance Test
Output Voltage
Load Regulation
Voltage Accuracy
IR Range
Photovoltaic Test
& Automation
Test Timer
Optical
Devices
AC: 0.05~5.0kV / DC : 0.05~6.0kV
≦(1% of output + 0.1% of full scale)
± ( 1% of setting + 0.1% of full scale)
2V
AC: 0.001mA~120mA (Voltage ≦4kV)
AC: 0.001mA~100mA (Voltage >4kV)
DC: 0.0001mA~20mA
± (1% of reading + 0.5% of range)
Test time:0.3 ~ 999 sec., and continue
Ramp / Fall / Dwell time:0.1 ~ 999 sec., and off
50Hz / 60Hz
Sine wave
Multi-Channel Hipot Tester
KEY FEATURES
■ 10/4 channels in one design
■ 10 sets of sync output and measurement
■ AC/DC/IR 3 in 1 EST test
■ Master/Slave link - 10 units max.
■ Programmable V-output and limits
■ OSC (Open/Short Check)
■ Flashover detection
■ 1MΩ~50GΩ insulation resistance test
■ Standard RS-232 / Handler interface
■ Optional GPIB interface
■ Large LCD panel
■ Panel lockup function
■ Easy operating interface
■ CE Mark
■ High Efficiency Hipot Test Solution
High Efficiency Hipot Test Solution
Hipot test is one of the major test items in
electrical safety test. All electrical components
and products including transformers, capacitors,
power supplies, chargers and home appliances all
require hipot test.
With more than 20 years experience in developing
the instruments for test and measurement,
Chroma creates the 19020 multi-channel hipot
tester with a brand new architecture. It can
measure the hipot leakage current of all channels
at the same time and conduct tests on 100 DUTs
at most simultaneously.
There is no need to purchase various Hipot testers
to save the production line space if Chroma
19020 is in use. Its one time multi-channel test
can increase the efficiency of electrical regulatory
test. It improves the productivity and reduces the
risk of test for the products that require hipot test
only.
Chroma 19020 also has powerful functions in
Flashover detection and Open/Short Check. It
contains several international patents and is the
best tool for electrical regulatory hipot test as
not only reliable quality can be obtained, highly
efficient test platform can be created.
19020-synchronized output
13-9
Model 19020 Series
World's First Sync Hipot Test (Patent Registered)
Chroma 19020 has equipped with the world's
first sync hipot test function that one single
unit can perform 10 channels sync output and
measurements simultaneously. Maximum 10
units (master & slave) can be controlled to have
100 channels in total. They can be grouped for
output to avoid creating voltage difference
due to adjacent tests as well as to improve the
productivity.
ORDERING INFORMATION
19020 : Multi-channel Hipot Tester
19020-4 : Multi-channel Hipot Tester (4CH)
19021 : Multi-channel Hipot Tester (AC)
19021-4 : Multi-channel Hipot Tester (AC/4CH)
19022 : Multi-channel Hipot Tester (DC/IR)
19022-4 : Multi-channel Hipot Tester (DC/IR/4CH)
19023-8-20 : Multi-channel Hipot Tester (8kVAC/4CH)
A190200 : 19" Rack Mounting Kit for 19020 Series
A190201 : 3-way Scanner Box (10CH)
A190202 : 3-way Scanner Box (4CH)
A190203 : 19020 Series Hipot Tester software
A190508 : GPIB Interface
* HV cable is option for customize requirement
SPECIFICATIONS
Model
19020
19021
19022
19023-8-20
ACWV/DCWV/IR/
ACWV/
DCWV/IR/
ACWV/
Multi-channel
Multi-channel
Multi-channel
Multi-channel
Withstanding Voltage Test
AC : 0.05 ~ 5kV,
Output Voltage
AC : 0.05 ~ 6kV
DC : 0.05 ~ 8kV
AC : 0.05 ~ 8kV
DC : 0.05 ~ 6kV
Load Regulation
of
setting
+
of
full
scale)
0.1%
≦(1%
Voltage Resolution
2V
Voltage Accuracy
±(1% of setting + 0.1% of full scale)
AC : 0.01~10mA,
Cutoff Current
AC : 0.01 ~ 8mA
DC : 0.001 ~ 3.5mA AC : 0.01 ~ 20mA
DC : 0.001~5mA
Current Resolution
AC : 1μA, DC : 0.1μA
Current Accuracy
±(1% of setting +0.5% of full scale)
Output Frequency
50Hz / 60Hz
Flashover Detection
AC : 1mA ~ 20mA ; DC : 1mA ~ 10mA , step 0.1mA
Test Time
0.03 ~ 999.9 sec, continue
Ramp Time
0.1 ~ 999.9 sec, off
Fall Time
0.1 ~ 999.9 sec, off
Dwell Time
0.1 ~ 999.9 sec, off
Waveform
Sine wave
Insulation Resistance Test
Output Voltage
DC : 0.05 ~ 1kV
DC : 0.05 ~ 1kV
Voltage Resolution
2V
Voltage Accuracy
±(2% of setting + 0.5% of full range)
IR Range
1MΩ ~ 50GΩ
1MΩ ~ 1GΩ : ± 3% of reading + 0.1% of full range
1GΩ ~ 10GΩ : ± 7% of reading + 0.2% of full range
Resistance ≥ 500V
10GΩ ~ 50GΩ : ± 10% of reading + 1% of full range
Accuracy
< 500V
1MΩ ~ 1GΩ : ± 3% of reading + (0.2*500/Vs)% of full scale
Test Time
0.3 ~ 999.9 sec, continue
Memory Storage
30 instrument setups with up to 10 test steps can be stored into and
Save/Recall
recalled from the internal memory
Secure Protection Function
Fast Output Cut-off
0.4ms after NG happen
Panel Operation Lock
Present password
Interlock
YES
GO/NG Judgment Window
GO : Short sound, Green LED
Indication, Alarm
NG : Long sound, Red LED
Data Hold
Least tests data memories
Memory Storage
30 instrument setups with up to 10 test steps
Interface
RS-232, Handler & GPIB
CANBus & data control interface are used for Max. 10 units of master & slaves connection
General
Temperature : 0˚C ~ 45˚C
Operation
Environment
Humidity : 15%~95% RH @ ≦40˚C and no condensation
Power Consumption
Standby : < 250W ; With rated load : <1000W
Power Requirements
90~264Vac ; 47~63Hz
Dimension (HxWxD)
174 x 428 x 600 mm / 6.85 x16.85 x 23.62 inch
Weight
Approx.40 kg/88.18lbs
Mode
All specifications are subject to change without notice.
AC/DC/IR/SCAN Hipot Tester
Model 19052/19053/19054
Photovoltaic Test
& Automation
AC : 0.05 ~ 5kV, DC : 0.05 ~ 6kV
≦ (1% + 5V)
2V
±(1% of reading + 5 counts)
AC : 30mA, DC : 10mA
AC : 1µA, DC : 0.1µA
±(1% of reading + 5 counts)
50Hz/ 60Hz
0.3 ~ 999 sec, continue
0.1 ~ 999sec, off
Sine wave
DC : 0.05 ~ 1kV
2V
1MΩ~ 50 GΩ
0.1MΩ
--
4 ports, ±phase
Programmable setting
AC : 1mA ~ 15mA, DC : 1mA ~ 10mA
PXI Test &
Measurement
0.4 ms after NG happen
0.2 sec
0.5mA ± 0.25mA AC, Close
Present password
1Ω± 0.2Ω, Off
GO: Short sound, Green LED; NG: Long sound, RED LED
Least tests data memories
99 steps or 99 groups for total 500 memory locations
Input : Start, Stop, Interlock (at 11 pin terminal block only) ; Output : Under test, Pass, Fail
Temperature: 0˚C ~ 40 ˚C, Humidity: ≦ 80 % RH
No load: <100 W, With rated load: ≦ 500 W max.
100V / 120V / 220V(AC ± 10%) / 240V(AC + 5% ˜ -10%), 50 / 60 Hz
105 x 320 x 400 mm / 4.13 x 12.6 x 15.75 inch
15 kg / 33.4 lbs
15.4 kg / 33.92 lbs
16.5 kg / 36.34 lbs
UL, TUV, CE
CE
UL, TUV, CE
All specifications are subject to change without notice.
13-10
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Scanner Unit
ARC Detection (Flashover)
Setting Mode
Detection Current
Secure Protection Function
Fast Output Cut-Off
Fast DC discharge
Ground Fault Interrupt (GFi)
Panel Operation Lock
Continuity Check
GO/NG Judgment Window
Indication, Alarm
Data Hold
Memory Storage
Remote Connector
Real Panel connector
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
Certification
Semiconductor/
IC
1MΩ~2.5GΩ
2.2GΩ~50GΩ
0.1MΩ~250MΩ
0.22GΩ~50GΩ
DC : 0.05 ~ 1kV
2V
±(1% of reading + 5 counts)
1MΩ~ 10 GΩ
0.1MΩ
±(5% of reading + 2% of full scale)
±(15% of reading + 1% of full scale)
±(10% of reading + 2% of full scale)
±(15% of reading + 1% of full scale)
8 ports, ±phase
Electrical
Safety
< 500V
19054
ACWV / DCWV / IR / SCAN
Power
Battery Test &
Passive
Electronics Automation Component
≧ 500V
19053
Automated
Optical Inspection
Resistance
Accuracy
19052
ACWV / DCWV / IR
Optical
Devices
A190512 : Auto Control TR. Scan Box (3002B)
SPECIFICATIONS
Model
Mode
Withstanding Voltage Test
Output Voltage
Load Regulation
Voltage Resolution
Voltage Accuracy
Cutoff Current
Current Resolution
Current Accuracy
Current Frequency
Test Time
Ramp up Time
Waveform
Insulation Resistance Test
Output Voltage
Voltage Resolution
Voltage Accuracy
IR Range
Resistance Resolution
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ 3 in 1 Tester : AC, DC, IR
■ Programmable output voltage to 5kV AC and
6kV DC
■ Trip current programmable to 30mA AC and
10mA DC
■ Insulation resistance to 50GΩ/1000V DC
■ Built-in 8 channel SCANNER (19053 only)
■ Built-in 4 channel SCANNER (19054 only)
■ Open/Short Check (OSC)
■ Ground Fault Interrupt (GFI)
■ ARC detection (Flashover)
■ Storage of 50 Tests Setups with 100 Steps per
setup
The Chroma Hipot Tester 19052/19053/19054
provides 3 models to choose. The 19052 includes
AC/DC/IR Hipot testing and insulation resistance
(IR) measurements, the 19053 which combines
both AC and DC Hipot tests and IR measurements
with 8HV scan channel capability into a single
compact unit, and the 19054 which combines
both AC and DC Hipot tests and IR measurements
with 4HV scan channel capability into a single
compact unit. The front panels of the fevers
make them easy to operate. Digital display and
user friendly control allows test parameters and
limits to be set easily without the high voltage
activating.
Video &
Color
■ Optional transformer test fixture (19053 only)
■ Standard RS-232 Interface
■ Optional GPIB Interface
ORDERING INFORMATION
19052 : Hipot Tester (AC/DC/IR)
19053 : Hipot Tester (AC/DC/IR/8CH SCAN)
19054 : Hipot Tester (AC/DC/IR/4CH SCAN)
A190344 : HV Gun
A190512 : Auto Control TR. Scan Box (3002B)
A190508 : GPIB Interface
A190517 : 19" Rack Mounting Kit for Model
19052/19053/19054
A190518 : Hipot Tester software
A190702 : 40kV HV Test Probe
A190704 : Start Switch
A190708 : ARC Verification Fixture
Hipot Analyzer
FUNCTIONS
■ Hipot
- AC 5kV/100mA
- DC 6kV/25mA
■ Insulation
- 5kVmax
- 1MΩ~50GΩ
KEY FEATURES
■ 500VA output rating
■ Floating output complies with EN50191
■ Corona Discharge Detection (CDD, 19055-C)
■ Flashover Detection
■ Discharge Level Analysis (DLA)
■ Open Short Check (OSC)
■ High Frequency Contact Check (HFCC)
■ Ground Fault Interrupt
■ Standard RS-232 & HANDLER interface
■ Option GPIB interface
■ Key lock when fail
■ Programmable voltage & test limit
■ Support A190301 8HV Scanning Box
APPLICATIONS
Motor : The 19055 Series Hipot Analyzers with
500VA output rating can be used to test and
analyze the withstand voltage of high power and
leakage current for the products like motor stators
and rotors with high parasitic capacitance. Corona
detection can be used for turn-to-turn or turn-toground test to avoid winding insulation failure
from corona discharge.
Transformer : When using a power transformer
under the normal voltage, a primary side corona
discharge could cause the adjacent components
to be damaged if occurred. Thus, the function of
Corona Discharge Detection (CDD) of 19055-C can
be used to detect if there is any corona discharge
occurred to improve the product quality.
High Voltage Capacitor, Photocoupler &
Insulation Material : If any gaps, voids or
impurities appeared when doing molding in the
manufacturing process, the insulation capability
may be affected. The Corona Discharge Detection
(CDD) equipped by 19055-C is able to defect if
there is any corona discharge occurred to enhance
the product quality.
C h ro m a 19055 S e r i e s H i p o t An a l y ze r s a re
designed for hipot tests and analysis. The tests
of AC/DC/IR can be programmed in 5kV/100mA
with 500VA output rating which complies with
the EN50191 requirements. (Please refer to the
application notes for more detail information.)
The 19055-C has not only the AC/DC/IR tests but
also a new measurement technology - Corona
Discharge Detection (CDD) that can detect the
following via the Discharge Level Analysis (DLA).
- Corona discharge Start Voltage (CSV)
- Flashover Start Voltage (FSV)
- BreakDown Voltage (BDV)
13-11
Model 19055/19055-C
As to the Contact Check during Hipot test, Chroma
19055 Series is equipped with a new function of
High Frequency Contact Check (HFCC) besides
the Open Short Check (OSC). By conducting the
Contact Check during Hipot test, it can increase
the test reliability and efficiency significantly.
For convenience use, Chroma 19055 has large
LCD screen for operation and judgment. In
addition, the GFi human protection circuit and
Floating safety output prevent the operators from
electrical hazard.
SPECIFICATIONS
Model
Mode
Withstanding Voltage Test
Output Voltage
Load Regulation
Voltage Accuracy
Voltage Resolution
Cutoff Current
Current Accuracy
Current Resolution
Output Frequency
Test/Ramp/Fall/Dwell Time
Chrona Discharge in motor
ORDERING INFORMATION
19055 : Hipot Analyzer (AC/DC/IR)
19055-C : Hipot Analyzer
(AC/DC/IR with Corona discharge detection)
A190301 : 8HV Scanning Box
A190355 : 19" Rack Mounting Kit
A190356 : GPIB Interface
A190708 : ARC (Flashover) Verification Fixture
19055/19055-C
ACWV / DCWV / IR
AC : 0.05 ~ 5KV, DC : 0.05 ~ 6KV
≦(1% of setting + 0.1% full range)
±(1% of setting + 0.1% full range)
2V
AC : 100mA ; DC : 25mA
± (1% of reading + 0.5% of range)
AC : 1µA, DC : 0.1µA
50Hz ~ 600Hz
0.3 ~ 999 sec., continue / 0.1 ~ 999 sec.,
off / 0.1 ~ 999 sec., off / 0.1 ~ 999 sec., off
Sine wave
Waveform
Insulation Resistance Test
Output Voltage
DC : 0.05 ~ 5kV
Voltage Resolution
2V
Voltage Accuracy
±(1% of reading + 0.1% of full scale)
IR Range
0.1MΩ ~ 50GΩ
Resistance Resolution
0.1MΩ
1MΩ ~ 1GΩ
± (3% of reading + 0.1% of full scale)
>1kV
1GΩ ~ 10GΩ
± (7% of reading + 2% of full scale)
10GΩ ~ 50GΩ
± (10% of reading + 1% of full scale)
Resistance
1MΩ ~ 1GΩ
± (3% of reading + 0.1% of full scale)
Accuracy
0.5kV
1GΩ ~ 10GΩ
±(7% of reading + 2% of full scale)
~1kV
10GΩ ~ 50GΩ
± (10% of reading + 1% of full scale)
<500V 0.1MΩ ~ 1GΩ
± (3% of reading + (0.2 x 500/Vs)% of full scale)
Flashover Detection
Setting Mode
Programmable setting
Detection Current
AC: 20mA;DC: 10mA
Contact Check Function
HFCC
High frequency contact check
OSC (open/short check)
600Hz, 0.1s
Electrical Hazard Protection Function
Floating output design
Leakage current <3 mA
Fast Output Cut-off
0.4ms after NG happen
Ground Fault Interrupt
0.5mA ±0.25mA AC, ON/OFF
Panel Operation Lock
Present password
Interlock
YES
GO/NG Judgment Window
Indication, Alarm
GO : Short sound, Green LED ; NG : Long sound, Red LED
Memory Storage
100 sets, max. 50 steps per set
Interface
Interface
RS-232, Handler interface (Standard), GPIB interface (Optional)
General
Operation Environment
Temperature: 0˚C ~ 45˚C, Humidity: 15% to 95% [email protected]≦ 40˚C
Power Consumption
500VA
Power Requirements
90~132Vac or 180~264Vac, 47~63Hz
Dimension (H x W x D)
130 x 430 x 500 mm / 5.12 x 16.93 x 19.69 inch
Weight
Approx. 20kg / 44.09 lbs
All specifications are subject to change without notice.
Hipot Analyzer
Model 19056/19057 Series
Video &
Color
DC : 0.1 ~ 5kV
2V
1% of setting + 0.5% of full scale 1.5% of setting + 0.5% of full scale
0.1MΩ ~ 50GΩ
0.1MΩ
± (3% of reading + 0.5% of full scale)
± (5% of reading + 1% of full scale)
± (10% of reading + 1% of full scale)
± 5% of reading + (0.5*300/Vs)% of full scale
-
Programmable setting
AC : 1mA~20mA
OSC (open/short check)
HVCC(High Voltage contact check)
All specifications are subject to change without notice.
HVCC(High Voltage contact
check)
HVCC(High Voltage contact
check)
Yes (password control)
YES
-
GO : Short sound, Green LED; NG : Long sound, Red LED
100 sets ,max. 50 steps per set
Standard-RS232, Handler interface ,USB , SCAN ; Optional - GPIB interface
Temperature: 0℃ ~ 45℃ ; Humidity: 15% to 95% [email protected]≦ 40℃
500VA
90~132Vac or 180~264Vac, 47~63Hz
130x430x500 mm/5.12x16.93x19.69 inch
28kg / 61.7 lbs
13-12
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
0.5mA±0.25mA AC, ON/OFF
DC : 1mA~10mA
PXI Test &
Measurement
Electrical Hazard Protection Function
Ground Fault Interrupt
Key Lock
Interlock
GO/NG Judgment Window
Indication, Alarm
Memory Storage
Interface
General
Operation Environment
Power Consumption
Power Requirements
Dimension (HxWxD)
Weight
-
Semiconductor/
IC
Contact Check
DC: 0.1~12kV
DC : 0.1 ~ 20kV
± (1% of output + 10V), Rated load
± (1% of setting + 0.1% of full scale),
± (1.5% of setting + 0.1% of full
scale), 10V resolution
10V resolution
2V
0.01~20mA
0.001~10mA
0.001~5 mA
0.100mA~2.999mA :
±(1% of reading + 0.3% of full range)
±(1% of reading + 0.5% of full range)
3.00mA~20.00mA :
±(1.5% of reading + 0.3% of full range)
AC : 1μA, DC : 0.1 μA
50Hz / 60Hz
0.3 ~ 999 sec., continue / 0.1 ~ 999 sec., off / 0.1 ~ 999 sec., off / 0.1 ~ 999 sec., off
Sine wave
Electrical
Safety
Current Resolution
Output Frequency
Test/Ramp/Fall/Dwell Time
Waveform
Insulation Resistance Test
Output Voltage
Voltage Resolution
Voltage Accuracy
IR Range
Resistance Resolution
1MΩ ~ 1GΩ
1GΩ ~ 10GΩ
Resistance ≧0.5kV
Accuracy
10GΩ ~ 50GΩ
<0.5kV
1MΩ ~ 1GΩ
Flashover Detection
Setting Mode
Detection Current
Contact Check Function
AC: 0.1~10kV
Power
Battery Test &
Passive
Electronics Automation Component
Current Accuracy
19057-20
DCWV / IR
Automated
Optical Inspection
Voltage Regulation
Cutoff Current
19057
DCWV / IR
Photovoltaic Test
& Automation
Voltage Accuracy
19056
ACWV
ORDERING INFORMATION
19056 : Hipot Analyzer AC10kV
19057 : Hipot Analyzer DC12kV/IR
19057-20 : Hipot Analyzer DC20kV/IR
A190316 : Dummy Load
A190355 : 19" Rack mounting kit
A190356 : GPIB interface
A190519 : HV contact check box (HVCC)
A190702 : 40kV HV test probe
A190708 : ARC verification fixture
Optical
Devices
SPECIFICATIONS
Model
Mode
Withstanding Voltage Test
Output Voltage
Load Regulation
The Hipot Analyzer provides high withstand
voltage analysis for optical couplers, HV relays,
HV switches and PV modules, which have better
insulation capability.
Charge and discharge are required for capacitive
components when doing DC withstand voltage
tes t. T he Hip ot Analy zer s have fast charge
function that can increase the production test
efficiency .
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ 10kV AC & 20kV DC withstand voltage test
■ 0.1MΩ~50GΩ insulation impedance test
■ BDV (BreakDown Voltage test)
■ HVCC (High Voltage Contact Check)
■ OSC (Open Short Check)
■ GFI (Ground Fault Interrupt) human
protection circuit
■ Fast charge/discharge function
■ Programmable output & test limit
■ Standard RS232 & HANDLER interface
■ Optional GPIB interface
■ Key lock function
Ch ro m a 19056/19057 H ip o t An a l y z e r is a n
equipment specially designed for testing and
analyzing ultra-high withstand voltage. The
series of models include 10kVac/12kVdc/20kVdc
with maximum AC20mA/DC10mA output can
perform AC/DC withstand voltage and insulation
resistance tests with contac t check during
production line test. In addition to the patented
OSC (Open Short Check), High Voltage Contact
Check is added to test the components with high
insulation capability when high voltage outputs
to improve the testing reliability and efficiency.
AC/DC/IR Hipot Tester
Model 19070 Series
ORDERING INFORMATION
KEY FEATURES
■ Compact size Hipot tester
■ Three instruments in one: AC Hipot, DC Hipot,
Insulation Resistance (19073)
■ Open/Short Check (OSC)
■ ARC detection (Flashover)
■ Provide reliable and stable test results
■ Storage of 10 Tests Setups with 60 Steps per
setup
■ Ground Fault Interrupt (GFI)
Chroma 19070 series are the smallest Hipot
Testers currently available in the world. Its super
mini size is easy to carr y and the large LCD
display is suitable for viewing measurement
results. These sophisticate Hipot Testers are
most applicable to safety test for electronic
components.
A190701 : Remote Control Box
SPECIFICATIONS
Model
Mode
Withstanding Voltage Test
Output Voltage
Load Regulation
Voltage Resolution
Voltage Accuracy
Cutoff Current
Current Resolution
Current Accuracy
Current Frequency
Test Time
Ramp up Time
Waveform
Insulation Resistance Test
Output Voltage
Voltage Resolution
Voltage Accuracy
1MΩ~ 1000MΩ
1GΩ~ 10GΩ
Resistance ≧ 500V
Accuracy
10GΩ~ 50GΩ
< 500V
0.1MΩ~ 1000MΩ
ARC Detection
Setting Mode
Detection Current
Secure Protection Function
Fast Output Cut-off
Fast Discharge
Ground Fault Interrupt
Continuity Check
Panel Operation Lock
GO/NG Judgment Window
Indication, Alarm
Data Hold
Step Hold
Memory Storage
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
Certification
13-13
19071 : Hipot Tester (AC)
19073 : Hipot Tester (AC/DC/IR)
A190344 : HV Gun
A190701 : Remote Control Box
A190702 : 40kV HV Test Probe
A190704 : Start Switch
A190706 : 19" Rack Mounting Kit for
Model 19070 series
A190708 : ARC Verification Fixture
A190702 : 40kV HV Test Probe
19071
ACWV
AC : 0.05 ~ 5kV
AC : 0.1mA ~ 20mA
-
19073
ACWV / DCWV / IR
AC : 0.05˜ 5kV, DC : 0.05 ~ 6kV
≦(1% + 5V)
2V
±(1.0% of reading + 5 counts)
AC : 0.1mA ~ 20mA, DC : 0.01mA ~ 5mA
AC : 1µA, DC : 0.1µA
±(1.0% of reading + 5 counts)
50Hz/ 60Hz
0.3 ~ 999 sec, continue
0.1 ~ 999 sec, off
Sine wave
DC : 50 ~ 1000 V
2V
±(5% of reading + 5 counts)
± (4% of reading + 5 counts)
± (7% of reading + 5 counts)
± (12% of reading + 5 counts)
± (7% of reading + 5 counts)
Programmable setting
AC : 1mA ~ 20mA, DC : 1mA ~ 5mA
Approx. 0.4mS, after NG happen
Approx. 0.2S, Typical
0.5mA ± 0.25mAac (ON), OFF
0.1Ω ~ 5.0Ω ± 0.2Ω, GC MODE
Yes
GO: Short sound; NG: Long sound
Least tests data memories
Step signal trigger ON / OFF
10 tests setups with 60 steps pre setup
Temperature: 0˚C ~ 40 ˚C, Humidity: ≦ 80 % RH
No load : <60 W, With rated load : ≦ 300 W
100V / 120V / 220V / 240V, 50 / 60 Hz
105 x 270 x350 mm / 4.13 x 10.74 x 13.78 inch
105 x 270 x350 mm / 4.13 x 10.63 x 13.78 inch
11 kg / 24.23 lbs
UL, TUV, CE
All specifications are subject to change without notice.
Impulsing Winding Tester
Model 19301A
Deterioration Detection
All specifications are subject to change without notice.
4-Terminal Measurement Diagram
• Continued on next page ➟
13-14
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Breakdown Voltage ( B.D.V)
The19301A has breakdown voltage analysis built
in. The start voltage, end voltage, and percentage
between each step can be set under the
breakdown voltage (BDV) test mode. While the
test voltage increases in each step, it can use Area
Size, Laplacian, and Peak ratio functions to judge
whether the result from each function is over
PXI Test &
Measurement
WV Test & Peak Ratio Waveform
Semiconductor/
IC
4-Terminal Measurement
Since the voltage detection of common 2-wire
layer short test device is inside the current loop,
the measured voltage is quite different from
the DUT for low inductance measurement. The
Chroma 19301A uses dual coaxial 4-wire detection
to significantly improve the voltage accuracy for
correct test results.
Electrical
Safety
High/Low Inductance Products Test
The 19301A not only has low inductance product
test technology but also covers high inductance
product tests. It is able to test products with
inductance values from 0.1uH to 100uH.When
the sample is measured for induc tance, the
19301A automatically switches to the proper
range according to the measurement for the
sample and test. This waveform sample is then
used to compare with the DUT to verif y that
the DUT has the proper waveform. This is a very
convenient function for the operator. Combining
the applications of the high & low inductance test
technologies into a single layer short tester not
only reduces changeover time on the production
line helping production management, but also
reduces the cost of facility/equipment for the
factory.
Power
Battery Test &
Passive
Electronics Automation Component
Contact Check ( Patent: I516773)
The Chroma 19301A performs a Contact Check,
which can extend the service life of the fixture
or probe, before the test in order to avoid poor
contact or open circuits that would cause the
19301A to generate a high volt age output,
preventing arcing to the fixture or probe and
damage to the DUT.
Automated
Optical Inspection
The 19301A, which is specifically designed for
wound component tests, utilizes a high voltage
& low capacitance capacitor (low test energy)
in parallel with a coil to form an RLC resonant,
which is called damping. Analyzing the decay of
the waveform via an analysis technology with
high speed, precise, and accurate sampling can
successfully detect poor insulation within a
Under the impulse winding test (IW T) mode,
the Δ Peak or Δ Peak Ratio can be used for
detecting defective products by comparing the
Peak Ratio from the test product with a known
good product. After the withstand voltage test is
done and the switch is opened (SW1 OFF), it uses
the Peak Ratios from the DUT and the sample to
calculate the Δ Peak or Δ Peak Ratio, which is
the difference of the Peak Ratio between the DUT
and the sample or the difference of the Peak Ratio
between the DUT and the sample in the decay
ratio from the sample for identifying defective
products.
Photovoltaic Test
& Automation
T h e insp e c tion of wound co mp o n ent s fo r
production includes the electrical characteristics
test and the withstand voltage test of the
electrical safety standard. Poor insulation of
a coil, which is a common issue that causes
layer short and/or short circuit with the output
pin during use, can be caused by bad design,
bad molding process, or deterioration of the
insulation material. Therefore, it is necessary
to perform the layer short test on any winding
component or coil.
Under the breakdown voltage (BDV) test mode,
the Peak Ratio can be used to detect the changes
of the parallel resistance (Rp) of the DUT for
inspecting the abnormality or deterioration of
the Rp. After the withstand voltage test is done
and the switch is opened (SW1 OFF), it calculates
the Peak Ratio from the measurement, which is
the ratio of the 2nd peak value to the 1st peak
value of the oscillatory voltage waveform. As
the voltage increases continuously, the Peak
Ratio can inspect the changes of the Rp that are
caused by the abnormality or deterioration in
order to find the breakdown voltage (BDV) or the
deterioration voltage (DTR.V). The larger Peak
Ratio indicates the greater Rp value, which also
means the higher Q value.
Optical
Devices
T h e C h r o m a 19 3 01A i m p u l s e W i n d i n g
Tester combines high & low inductance test
technologies, has a maximum impulse voltage of
1000V, and a high speed sampling rate of 200MHz
which satisfies most of the test requirements for
power inductor products with a wide inductance
r a n g e f r o m 0.1u H t o 10 0 u H . T h e b u i l t- i n
functions of Area Size Comparison, Differential
Area Comparison, FLUTTER Value, LAPLACIAN
Value, ΔPEAK or ΔPEAK RATIO, PEAK RATIO and
ΔRESONANT AREA functions are able to inspect
coils for poor insulation effectively.
Rp Check
The Peak Ratio and the Δ Peak or Δ Peak Ratio
are unique testing technologies from Chroma.
Before performing any tests, a large core loss
or a short circuit between the core and enamel
insulated wire of wound components can cause
the Q values to drop (smaller Rp).
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ Apply high/low inductance test
(0.1uH~100uH)
■ 10V~1000V impulse voltage test,
with 0.06V test resolution
■ 20mS high speed test (P1.0 for ACQ)
■ Inductance contact check function
■ Inductance differential voltage
compensation function
■ High impulse test sampling rate
(200MHz),10bits
■ Breakdown Voltage Analysis (BDV)
■ Low voltage range to increase the
sensibility of waveform analysis
(25V/50V/100V/200V/400V/800V/1000V)
■ Traditional Chinese/Simplified Chinese/
English user interface
■ USB port for storing waveform &
screen capture
■ Graphical color display
■ Standard LAN, USB and RS232 interface
Video &
Color
coil. It provides the winding quality test and the
withstand voltage test on the cores for power
inductors, and also makes the manufacturer and
user checks of the quality of winding component
products more efficient.
the specified limit in order to find the withstand
voltage of the test coil. In addition, it can also use
the Deterioration Detection function to find the
deterioration voltage (DTR.V). R&D engineers can
analyze and research the product and improve
any weaknesses of a coil design by using these
functions under BDV test mode.
Impulsing Winding Tester
High Speed Automated Testing Application
The low inductance products are used in smartphones, tablet PCs, etc., so the size of the inductor
trends toward smaller, thinner and lighter.
Fully automated test and packing machines,
which have a high production speed, are used
in producing these inductors. Therefore, high
speed test equipment is required to satisfy the
high speed of production. The Chroma 19301A
provides high speed tests and uses dual coaxial
4-wire detection (4-Terminal Measurement) to
reduce the impact of wiring length, which can
work perfectly with automated machines for
layer tests in order to provide greater benefit for
customers. The shortest length of time for the
high speed test has been improved to 18ms,
which can considerably improve the quantity of
automated production output.
SPECIFICATIONS
Model
Applied Voltage (Vpeak), Step
Test Inductance Range
Voltage Accuracy
Sampling Rate
Sampling Range
Pulse Number
Screen Display Resolution
Waveform Display Range
Detection Mode
Test Time
Electrical Hazard Protection Function
Key Lock
Interlock
Indication, Alarm
Interface
General
Operation Environment
Power Consumption
Power Requirements
Dimension (W x H x D)
Weight
Model 19301A
SMD Power Choke Test Fixture
The size of a low inductance Power Choke is
quite small. Chroma has developed a 4-Terminal
measurement fixture (patent), which can work
with the voltage compensation by inductance
difference, specifically for the SMD Power Choke in
order to facilitate the operation of the layer short
test and to improve test efficiency for the R&D
engineer, the product developer, and the QA staff.
SMD Power Choke Test Fixture (A193001)
19301A
10V~1000V, 1V *1, *2
0.1µH ~ 100µH
±[1% of setting x (1+0.5µH / Lx) + 2% of Range]
10bit / 5ns (200MHz)
8 Ranges : 0, 1, 2, 3, 4, 5, 6, 7
Pulse Number : 1~32 ; Excitation Pulse Number : 0~9
640 x 480 dots (VGA)
colors display 512 x 256 dots
Area / Differential Area / Flutter Value / Laplacian Value / ΔPeak Ratio /Δ Resonant Area
Pulse1.0 : 20ms (ACQ)
Yes (password control)
Yes
GO : Short sound, Green LED ; NG : Long sound, Red LED
RS232, Handler, USB, LAN interface
Temperature : 0℃ ~ 45℃, Humidity : 15% to 95% R.H @ ≦ 40℃
No Load : <150VA ; Rated Load : <1000VA
100~240Vac, 50 / 60Hz
177 x 428 x 500 mm / 16.85 x 6.97 x 19.69 inch
26 kg / 57.32 lbs
Note *1 : Using standard test cable shipped along with Chroma's Tester is suggested as long test cable will affect the maximum voltage output.
Note *2 : Use a standard 1 meter test cable to test the maximum voltage spec. as the table shown below.
ORDERING INFORMATION
19301A : Impulsing Winding Tester
A193001 : SMD Choke Test Fixture
A193002 : 1m Test Wire + Test Clip
A193003 : 1m Test Wire + Flat Head Cutting
A193004 : 1m Test Cable BNC to BNC (including BNC Male Connector x 2)
A193005 : 19301A Software
13-15
All specifications are subject to change without notice.
Impulsing Winding Tester
Model 19305 Series
Video &
Color
ORDERING INFORMATION
19305 : Impulse Winding Tester
19305-10 : Impulse Winding Tester (10ch)
A190359 : : 16ch HV External Scanning Box
Automated
Optical Inspection
The Chroma 19305-10 can providing maximum
10 channels output for multichannel scanning
te s t s to s ave ti m e a n d l a b o r cos t s i n th e
manufacturers.
Power
Battery Test &
Passive
Electronics Automation Component
A190359 : 16ch HV External Scanning Box
SPECIFICATIONS
Model
Channel
Applied Voltage,
Step, and Energy
Inductance Test Range
Sampling Speed
Sampling Range
Pulse Number
Detection Mode
19305-10
10ch
100V ~ 6000V
10V Step
More than 10uH
10bit / 5ns (200MHz)
11 Range : 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11
Pulse Number: 1~32
Dummy Pulse Number: 0~9
Area / Differential Area ;
Flutter Value / Laplacian Value / ∆Peak ratio
Semiconductor/
IC
Electrical Hazard Protection
Key Lock
Interlock
Indication, Alarm
Interface
19305
1ch
Electrical
Safety
The impulse winding test is to impose a
non-destructive, high speed and low energy
voltage impulse on the DUT (Device Under Test)
to analyze/compare the equivalent waveform
Product Application
Transformer, Motor, Generator, Ignition Coil, Relay,
Solenoid Valve, Inductance and other coils.
Photovoltaic Test
& Automation
The inspection of winding components includes
electrical characteristics and safety withstand
voltage tests. Commonly poor insulation of coils
is the root for causing layer short and output pin
short-circuited during usage. The reason could
result from bad initial design, poor process or
deterioration of insulating materials; therefore,
adding the coil layer shor t test to winding
components has its necessity.
T h e Chro ma 19305 s eries is an e quip m ent
sp e ci f i c all y d e si g n e d f o r te s tin g w i n d in g
components utilizing a high voltage charged
micro capacitor (low test energ y) and coil
under test to form an RLC parallel resonant.
Analyzing the oscillation decayed waveform
via a high speed and sophisticated sampling
process technique can successfully detect the
coils with poor insulation. Analyzer can perform
impulse tests on wound components like motors,
transformers wound products. Not only reliable
quality but also efficient product control would
be obtained when implementing it to quality
verification by wound component test.
Yes (password control)
Yes
GO : Short sound, Green LED ; NG : Long sound, Red LED
RS232 ,USB , LAN interface
Power Consumption
Temperature : 0℃ ~ 45℃
Humidity : 15% to 95% [email protected]≦ 40℃
No Load : <150W
Rated Load: <1000W
100~240Vac, 50 / 60Hz
177 x 428 x 500 / 16.85 x 6.97 x 19.69 inch
26kg / 57.32 lbs
Model 19305-10
All specifications are subject to change without notice.
13-16
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Power Requirements
Dimension (H xW xD)
Weight
PXI Test &
Measurement
General
Operation Environment
Optical
Devices
The Chroma 19305 series Impulse Winding
Tester included with one channel(19305) and
10 channels output (19305-10), the 19305 series
has 6kV impulse voltage and 200MHz high
speed sampling rate to improve sensitivity of
discharge detection. To test more than 10uH, the
built-in Area Size Comparison, Differential Area
Comparison, FLUTTER value, LAPLACIAN value,
and ∆Peak ratio functions are able to inspect the
coils for poor coil insulation.
Five kinds of waveform judgement for testing
■ Area Size
■ Differential Area
■ Flutter Value
■ Laplacian Value
■ ∆Peak ratio
Flat Panel
LED/
Display Lighting
特點
■ High impulse test sampling rate
(200MHz),10bits
■ 6kV impulse test
■ Breakdown Voltage Analysis (BDV)
■ High speed test
■ 10 channels scan test (19305-10)
■ Support max. 40channels scanning test
■ Traditional Chinese/Simplified Chinese/
English user interface
■ USB port for storing waveform & screen
capture
■ Graphical color display
■ Standard LAN,USB and RS232 interfaces
of yield and defect products for good and no
good judgment. The main function of impulse
winding test is to discover the potential defects
such as layer short, corona or partial discharge
that is difficult to find in wound components in
early phase.
Electrical Safety Test Scanner
Model 19200
Removable and Master/Slave design
Because different produc ts have different
requirements and test procedures, Chroma
19200 offers different scanning modules for
combinations. These modules are: AC LINE
module, GENERAL module, AC LINE2 module.
EARTH module, GB&GBF module and SWITCH
module. Due to different modules have different
functions, users are able to combine different
modules for your needs.
KEY FEATURES
■ Support Electrical Safety Test Scanning
■ Support High / Low voltage circuit insulation
(Switch module)
■ Support 8 slots for plug-in (removable)
■ Max. 9 slaves for multiple scanners
(master/slave interface)
■ Standard RS-232 and USB interface
■ Optional GPIB interface
■ CE Mark
■ 19200 can be installed in Chroma Electrical
Equipment ATS model 8900
In recent years, International Electrotechnical
Commission (IEC) in order to make consumers
safer while using the electrical products, join
more requirements to test in the standard. It
makes electric to fit requirements by all tests
be performed which are very complicated and
different. The problem not only the course is
complicated and apt to make mistakes, but also
the manpower costs more.
Chroma 19200 can perform high / low voltage
switch and scan all safety tests by EST Analyzer
(Chroma 19032) inputs such as withstanding test;
Some modules support 20A for Leakage Current
test and Function Test; GB & GBF modules support
40A and Ground Floating.
Chroma 19200 can be installed in Chroma 8900
electrical equipment ATS for DUT which needs a
lot of procedures to test like medical equipment,
medical power, UPS, motor, etc., ATS can save
the manpower cost , reduce the mistake, data
management to improve quality and efficiency.
13-17
High / Low voltage circuit insulation
Most of products have to perform Electrical Safety
Test (high voltage) and Function Test (low voltage).
Chroma 19200 supports high and low voltage
isolation by SWITCH module. User can combine
high and low voltage tests like LCR measurement,
power performance and function test for one
sequence in one station and data collecting. That
improves test efficiency and reduces occurred test
risk.
MODULE DESCRIPTION
AC LINE
MODULE
AC LINE2
MODULE
GENERAL
MODULE
EARTH
MODULE
SWITCH
MODULE
GB
MODULE
GBF-1
MODULE
GBF-2
MODULE
SPECIFICATION (MASTER & SLAVE)
Model
19200
SCAN
Mode
Withstanding Voltage Test Scan
Max. Voltage
AC : 5kV, DC : 6kV
Insulation Resistance Test Scan
Max. Voltage
DC : 5kV
Ground Bond Test Scan
Max. Current
40A
Leakage Current Test Scan
Max. Voltage
AC 300V
Max. Current
20A
RS-232 , USB (Standard), GPIB (Optional)
Interface
General
Operation Environment
Temperature: 0˚C ~ 45˚C ; Humidity: 15% to 95% [email protected]≦ 40˚C
Power Consumption
500VA
Power Requirements
90~132Vac or 180~264Vac, 47~63Hz
Dimension (H x W x D)
310.8 x 438 x 495 mm / 12.24 x 17.24 x 19.49 inch
Weight
35 kg / 77.09 lbs
Certification
CE
All specifications are subject to change without notice.
Electrical Safety Test Scanner
GB Test
EARTH
4
GB
4
●
●
●
●
●
5KVac
6KVdc
100mA
5KVac
6KVdc
100mA
5KVac
6KVdc
100mA
Function Type
HIGH
LOW
●
●
●
●
●
●
●
Drive±,
Sense±
15V peak
40A
GBF-2
4
5KVac
6KVdc
40A
SWITCH
8
Floating
1 channels
Floating
2 channels
Power
Battery Test &
Passive
Electronics Automation Component
ORDERING INFORMATION
Automated
Optical Inspection
●
LINE
●
NEUTRAL
●
●
SENSE HIGH
LC Test
●
●
SENSE LOW
●
●
●
EARTH
●
LINE2
Note*1 : GB, GBF-1 and GBF-2 only can be used on frame #0
Note*2 : GBF-1 and GBF-2 have GB floating function
Note*3 : The GENERAL, ACLINE2, EARTH modules have flexible design which can be exchanged flexibly by terminals for different tests
5KVac
6KVdc
100mA
Photovoltaic Test
& Automation
Earthed
4 channels
set + or GBF-1
2
5KVac
6KVdc
40A
Optical
Devices
WVAC/WVDC/IR Test
AC LINE2
4
5KVac
6KVdc
20A
Max. Voltage
Max. current
Test Item
GENERAL
4
Flat Panel
LED/
Display Lighting
AC LINE
2
Video &
Color
MODULE SPECIFICATION
Module Name
Port No.
HIGH/LOW switch
Model 19200
Electrical
Safety
19200 : Electrical Safety Test Scanner (Master)
19200 : Electrical Safety Test Scanner (Slave)
A190349 : Universal corded product adapter
A190508 : GPIB Interface
A192000 : AC LINE module
A192002 : AC LINE2 module
A192003 : GENERAL module
A192004 : EARTH module
A192005 : GB module
A192006 : GBF-1 module
A192007 : GBF-2 module
A192008 : SWITCH module
A192010 : Power entry adapter of GBF module
A192011 : Blank Plate
Semiconductor/
IC
PXI Test &
Measurement
13-18
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Ground Bond Tester
KEY FEATURES
■ Wide resistance measurement range :
0.1 ~ 510 mΩ
■ High performance AC current output : 45 A
■ Compact size ground bond tester
■ Provide reliable and stable test results
■ Built-in resistance compensation function
■ Standard RS-232 interface
■ Optional GPIB Interface
■ Compatible with the model 19070 series Hipot
Tester
SPECIFICATIONS
Model
Mode
Grounding Resistance Test
Output Current
Resolution
Current Accuracy
Output Frequency
Resistance Range
Resistance Resolution
Resistance Accuracy
Offset
Offset Range
Test Time
Waveform
GO/NG Judgment
Limit
General
Operation Environment
Power Consumption
Power Requirement
Dimension (H x W x D)
Weight
Certification
13-19
Model 19572
The 19572 are instrument dedicated to measure
the grounding resistance within the range of
0.1~510mΩ. Its compact and easy to operate
feature is most suitable for the grounding test
in production line. By supplying high reliability
and stability test results with built-in resistance
compensate function; it is an economical and
useful grounding tester.
ORDERING INFORMATION
19572 : Ground Bond Tester
A190701 : Remote Control Box
A195702 : GPIB Interface
19572
Ground Bond
AC : 3 ~ 45A
3 ~ 30A, 0.01A / 30.1 ~ 45A, 0.1A
±(1.5% of setting + 0.5% of full scale)
50Hz / 60Hz
0.1 ~ 510 mΩ
(R display counts/ I display counts) ≧ 0.2, Resolution: 1mΩ
(R display counts/ I display counts) < 0.2, Resolution: 0.1mΩ
±(2% of reading + 0.5% of full scale)
A predetermined value can be subtracted from the measured value and the result of subtraction can be display
The result of subtraction can be compared with a Good/NO Good judgment reference value, and the result of comparison can
be use for the Good/NO Good judgment
0 ~ 100mΩ
0.5 ~ 999 sec., continue
Sine wave
A no-good judgment is made when a resistance greater than the high limit value Is detected.
A no-good judgment is made when the output current is cutout and a no-good Alarm signal is delivered.
If no abnormal state is detected during the test time, a good judgment is made and a good signal is deliver.
Hi-Limit : 0.1 ~ 510mΩ; Low-Limit : off, 0.1mΩ ~ Hi-Limit Value, 510mΩ max.
Temperature : 0˚C ~ 40 ˚C, Humidity : ≦ 80 % RH
No load(Ready state) : <100 W, With
rated load : ≦ 880W max.
100V / 120V / 220V (AC ± 10%) / 240V (AC -10% ~ +5%), 50 / 60 Hz
105 x 320 x 400 mm / 4.13 x 12.60 x 15.75 inch
16 kg / 35.24 lbs
UL, CE
All specifications are subject to change without notice.
Hipot Calibrator
Model 9102
Video &
Color
9102 : Hipot Calibrator
Standard Resistance(1.2kV max.)
General
Operation Environment
Power Requirement
Dimension (H X W X D)
Weight
AC : 6V (0.050V ~ 6.000V)
AC : 0.3% + 6 counts
1 mV
AC : 45A (0.500A ~ 45.000A)
AC : 0.3% + 6 counts
10 mA
45A Max. : 100 mΩ, 250W
Value
1000 MΩ
90.9 MΩ
9.9 MΩ
Power
Battery Test &
Passive
Electronics Automation Component
ORDERING INFORMATION
200μA / 2mA / 20mA / 200mA
AC : 0.3% + 6counts, DC : 0.2% +2 counts
10 nA/ 100nA/ 1μA/ 10μA
36mA : 33.3kΩ, 100W ; 24mA : 50kΩ, 80W
12mA : 100kΩ, 30W ; 4.8mA : 250kΩ, 10W
2.4mA : 500kΩ, 7W ; 0.12mA : 10MΩ, 1W
Automated
Optical Inspection
Grounding Resistance Test
Voltage Meter
Range
Accuracy
Resolution
Current Meter
Range
Accuracy
Resolution
Dummy Load
Insulation Resistance Test
AC : 2kV / 6kV, DC : 2kV / 10kV
AC : 0.3 % + 6 counts, DC : 0.2% + 2 counts
0.1V / 1V
Photovoltaic Test
& Automation
Dummy Load (1.2kV max.)
9102
Optical
Devices
The 9102 Hipot Calibrators is specially designed
standard devices for instrument calibration
lab. The 9102 can simulate multiple loads and
apply to various Hipot testers. These calibration
equipment can save manufacturers a great deal of
regular calibration fee.
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ Adequate for versatile testers
■ Precise designed standard calibration kit
■ Stable & accurate calibration equipment
■ Standard GPIB Interface and RS-232 Interface
SPECIFICATIONS
Model
Withstanding Voltage Test
Voltage Meter
Range
Accuracy
Resolution
Current Meter
Range
Accuracy
Resolution
Accuracy
2%
1%
1%
Temperature: 0˚C ~ 40˚C, Humidity : ≦ 80% RH
100V / 120V / 220V / 240V, 50 / 60 Hz
89 x 430 x 400 mm / 3.5 x 16.93 x 15.75 inch
8 kg / 17.62 lbs
Electrical
Safety
Semiconductor/
IC
PXI Test &
Measurement
13-20
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Electrical Equipment ATS
Model 8900
Because the requirement in standard of the
electric product increase day by day,, the testing
cost then increasing . In order to help the
manufacturer Reduce testing cost and products
risk effectively, Chroma provide 8900 electrical
equipment auto test system (ATS) be the best
solution by program the test of the complicated
procedure like the medical equipment safety and
function test and instrument safety and function
test.
8900 electrical equipment ATS can completion
that amount measurement and test procedure
in once automatically.This strong function not
only can be report formatted simply, but reduce
the careless mistake of the artificial writing and
improper test. Chroma 8900 electrical equipment
ATS is suitable for all electrical equipment test
solution within Electrical Safety Test.
FUNCTIONS
■ Support electrical safety test and function
test scanning :
- AC/DC WV Test
- IR Test
- GB Test
- LC Test (all types)
- Function test
■ Expandable Measurement function
- LCR Meter
- AC/DC Source
- DC Load
- Power Analyzer
- Timing/Noise Analyzer
- DMM
- Oscilloscope
- Other with GPIB or RS-232 device
KEY FEATURES
■ Open architecture software
■ Expandable hardware
■ Editable test library
■ Editable test programs
■ Editable and Test Item
■ Editable reports
■ Statistic report
■ User authority control
■ Activity log
■ Support Barcode reader
ORDERING INFORMATION
System
8900
Instrument
Electrical Safety Analyzer
Leakage Current Test Module
Multi Channel Module
Isolation Transformer
Electrical Safety Test Scanner
Scan Modules for 19200
LCR Meter
AC Source
DC Source
Power Analyzer
Power Meter
DC Load
Timing/Noise Analyzer
Timing/Noise module
Cable and Accessory
A600009
A600010
A800005
Chroma 8900 electrical equipment ATS solve
the Electrical Safety Test and special FUNCTION
test solution. The system can combine different
testers in the system accordding with different
test request what your need. The software is all
open architecture structure which can offer the
corresponding program and the most flexible test
item in accordance with special test procedure to
the customer for special products.
The all open architecture software of 8900 systems
includes the strong report editor and generator,
statistical analysis and functions of management.
Management of various types of different test
reports and operation that these functions make
the system have the ability to control quality and
reduce risk. These statistical analysis and report
function are indispensable for quality control
and product line testing in a modern electrical
manufacturer.
Electrical Equipment ATS
Refer to Model 19032-P
6000-05(10A) and 6000-08(20A) for 19032-P
6000-01 (3GC/5HV), 6000-02 (5GC/3HV), 6000-03 (8HV), for 19032-P
500VA (A190313)/ 1000VA(A190314)
Refer to Model 19200
AC Line Module(A192000)
General Module (A192003)
AC Line2 Module(A192002)
Earth Module (A192004)
GB Module(A192005)
GBF-1 Module (A192006)
GBF-2Module(A192007)
Switch Module (A192008)
Refer to Model 11022, 11025
Refer to Model 6500, 61500, 61600, 61700 series
Refer to Model 62000P Series
Refer to Model 6633 series
Refer to Model 66200 series
Refer to Model 6310A, 63200A, 6330A Series
80611
80611N
GPIB Cable (200 cm)
GPIB Cable (60cm)
PCI BUS GPIB Card (National Instrument)
APPLICATIONS
■ House Appliance
■ SMPS/Charger/UPS
■ Motor Function Test
■ Large EL Capacitor
■ PCB
■ Medical Device
■ Line Transformer
13-21
All specifications are subject to change without notice.
Medical Electrical Safety ATS
Model 8910
Video &
Color
Flat Panel
LED/
Display Lighting
Soft Panel
Optical
Devices
Test Report Editing
Statistical Report
Automated
Optical Inspection
Running GO/NOGO
Photovoltaic Test
& Automation
Power
Battery Test &
Passive
Electronics Automation Component
KEY FEATURES
■ Support electrical safety test and function
test scanning :
- AC/DC WV Test
- IR Test
- GB Test
- Earth Leakage Current
- Enclosure Leakage Current
- Patient Leakage Current
- Patient Auxiliary Leakage Current
■ Support customize function test (option)
■ Open architecture software
■ Automatically generate and save test report
Test Program Editing
CHROMA 19032-P EST Analyzer
GPIB
Scan Modules for 19200
AC Source
All specifications are subject to change without notice.
Medical Electrical Safety ATS base on 8900
Refer to Model 19032-P
6000-08 (20A) for 19032-P
6000-01 (3GC/5HV), 6000-02 (5GC/3HV), 6000-03 (8HV), for 19032-P
500VA (A190313)/ 1000VA(A190314)
Refer to Model 19200
AC Line Module(A192000)
General Module (A192003)
AC Line2 Module(A192002)
Earth Module (A192004)
GB Module(A192005)
GBF-1 Module (A192006)
GBF-2Module(A192007)
Switch Module (A192008)
Refer to Model 6400, 6500, 61500, 61600, 61700 series
13-22
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
ORDERING INFORMATION
System
8910
Main Instrument
Electrical Safety Tester
Leakage Current Test Module
Multi Channel Module
Isolation Transformer
Electrical Safety
Test Scanner
PXI Test &
Measurement
Chroma 19200 can allocate different modules
for special medical equipment test reach flexible
and time saving. Chroma 19200 with 8900/8910
test system can store test procedure and result
via computer for data mining and researching of
line manager and Quality control department.
Semiconductor/
IC
The leakage current test of medical equipment
includes four kinds - ELC, ECLC, PLC, PALC - to
test besides AC/DC/IR/GB test. Additionally,
normal / reverse / single fault normal / single
fault reverse four powers and earth switch, let
medical equipment safety test difficulty and
complexity further.
Electrical
Safety
The safety standard of medical equipment is
very strict. Because the medical equipment
keeps in touch with the health of the doctor
and patient frequently, make several Electrical
safety tests can't be ignored especially leakage
current test which has already become the most
important test in electrical safety test.
High Capacitance Electrolytic Capacitor ATS Model 1911
The system is a aluminum electrolytic capacitor
with high capacitance designed for measuring LC
and C/D/Z/ESR. It provides the best test solution
to high capacity electrolytic capacitor with data
record function. The general users spend longer
time to wait LC test in testing high capacitance
electrolytic capacitor. The system can install 8
electrolytic capacitors maximum at a time to
enhance 8 times of productivity. It will sound an
alarm after the test is completed. The operating
personnel process other operations to increase
the time efficiency in testing.
The screen consists of DUT model number
and lot number information. The software will
automatically bring out DUT test specifications
which includes LC test voltage, Dwell time, current
limit and C/D/Z/ESR value. Count Pass/Fail ratio
at the lowermost of main program for analysis
convenience of production line engineer.
ORDERING INFORMATION
1911 : High Capacitance Electrolytic Capacitor ATS
KEY FEATURES
■ Test parameter LC/C/D/Z/ESR
■ Test 8 electrolytic capacitors
■ Constant current for test leakage current
■ Special test clip fix DUT
■ Testing specification from program management
■ Test report auto generate
■ Statistic analysis
■ Software interface easy to operate
SPECIFICATIONS
Accurate and highly reliable hardware devices :
Capacitor Leakage Current/ IR Meter
Model
Main Function
Test Parameter
Test Signals Information
Voltage
Charge Current Limit
Measurement Display Range
Basic Measurement Accuracy *1
Fast
Measurement speed
(Ext. Trigger, Hold Range, Medium
Line Frequency 60Hz)
Slow
Function
Correction
Test Voltage Monitor
Charge Timer
Dwell Timer
Scanner
Model
Swith Module *1
Channels
Isolation Voltage
Max Current
GB Module *2
Channels
Max Current
13-23
11200 (650V)
Capacitor Leakage Current / IR Meter
LC, IR
1.0 V~100 V, step 0.1 V; 101V~650 V, step 1V;
±( 0.5% + 0.2V)
V ≤ 100V: 0.5mA~500mA
V > 100V: 0.5mA~150mA, 97.5W max.
step 0.5mA; ±( 3% + 0.05mA)
LC : 0.001μA~20.00mA
LC Reading : ±(0.3% + 0.005μA)
77 ms
143 ms
420 ms
Null zeroing
Vm: 0.0 V~660.0V;
±(0.2% of reading + 0.1V)
0~999 Sec.
0.2~999 Sec
LCR Meter
Model
Test Parameter
Test Signals
Level
11022
L,C, R,|Z|, Q, D, ESR, X,θ
10 mV~1V, step 10 mV; ±(10% + 3 mV)
50Hz, 60Hz, 100Hz, 120Hz,
Frequency
1kHz, 10kHz, 20kHz, 40kHz,
50kHz, 100kHz ; ±0.01%
Measurement Display Range
C (Capacitance)
0.001pF~1.9999F
L, M, L2 (Inductance)
0.001μH~99.99kH
Z (Impedance), ESR
0.01m~99.99MΩ
Q (Quality Factor)
0.0001~9999
D (Distortion Factor)
-180.00˚~ +180.00˚
θ(Phase Angle)
Note*1 : Swith module for leakage current measure
Note*2 : GB module for C/D/Z/ESR measure
19200
8ports, 4HV relays
max up to DC 6KV / AC 5KV
40A
4 Channels Driver & Sense
40A
All specifications are subject to change without notice.
Options of Electrical Safety Test Instruments
No.
Description
19020 19032 19032-P 19035 19036 19052
●
●
●
●
●
●
●
●
●
●
●
19056
19057 19305-10
19057-20
●
●
●
●
●
●
●
●
●
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Optical
Devices
●
●
●
●
●
●
●
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●
Photovoltaic Test
& Automation
●
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Power
Battery Test &
Passive
Electronics Automation Component
●
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Automated
Optical Inspection
●
●
●
Flat Panel
LED/
Display Lighting
* A190301 8HV Scanning box (5KV max) (9030A)
* A190313 500VA Isolation Transformer
* A190314 1000VA Isolation Transformer
* A190316 Dummy Load (3KV/25A)
A190321 GPIB Interface
* A190334 Ground Bond 40A
* A190336 8HV/8GB Scanning Box (9030AG)
* A190337 Ground Bond 60A
A190338 19001 EST Software
A190343 19" Rack Mounting Kit for 19032
* A190344 10kV HV Gun
A190346 RS-232 Cable for Impulse Winding Tester Connection
A190347 GPIB & Handler Interface
A190348 RS-232 Interface for 19035
* A190349 Universal Corded Product Adapter
* A190351 8ch-16ch HV box for 19035
A190355 19" Rack Mounting Kit
A190356 GPIB Interface for 19032-P
A190359 16 channel HV External Scanning Box (H, L, X)
* A190362 16 channel 4 wire HV External Scanning Box (H, L, X)
A190506 RS422 Interface
A190508 GPIB Interface
* A190512 Auto Transformer Scan Box (3002B)
A190517 19" Rack Mounting Kit
* A190701 Remote Control Box
* A190702 40KV HV Probe
* A190704 Start Switch
A190706 19" Rack Mounting Kit
* A190708 ARC Verification Fixture
(*) see pictures below
19053
19071
19055
19572
19054
19073
Video &
Color
FIXTURES AND ACCESSORIES
●
Electrical
Safety
A190316
A190334
A190336
A190337
A190344
A190349
A190351
A190362
A190512
A190701
A190702
A190704
A190708
All specifications are subject to change without notice.
13-24
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
A190314
PXI Test &
Measurement
A190313
Semiconductor/
IC
A190301
Semiconductor/IC Test Solution
Selection Guide
14-1
PXIe Digital IO Card
14-3
Programmable Pin Electronics Module
14-4
Four-quadrant DUT Power Supply
14-5
VLSI Test System
14-6
SoC/Analog Test System
14-9
Final Test Handler
14-17
System Level Test Handler
14-21
Other Application Test Handler
14-25
PXI/PXIe IC Test Platform
PXIe Digital IO Card
Programmable Pin Electronics Module
Four-quadrant DUT Power Supply
SoC/Analog Test System
VLSI Test System
Overview
Final Test Handler
Hybrid Single Site
Test Handler
Full Range Active Thermal
Control Handler
Tri-Temp Quad-site
Test Handler
Octad-site
Test Handler
RF Solution
Integrated Handler
System Level Test Handler
Hybrid Single Site
Test Handler
Tabletop Single Site
Test Handler
Automatic System Function Tester
Other Application Test Handler
Die Test
Handler
Miniature IC
Handler
Test-In-Tray
Handler
Selection Guides
Selection Guide - VLSI Test System
MXDPS
V Range
± 16 V
MXUVI
± 12 V
MXREF
± 48 V
MLDPS-16
12 V/± 6 V
Remark
12 V/± 6 V
--
PAGE
--
MLDPS
C Range
±2A
±1A
16 /board
± 1 A (± 6V)
32 /board
± 1 A (± 6V)
16 /board
--
8 /board
± 250 mA
16 /board
--
Channel
--
--
S slot
S / IO slot
S / IO slot
S / IO slot
S / IO slot
--
Yes
Yes
Yes
Yes
Yes
-1 -S/2CH
None
Yes (4A)
Yes (1A)
Yes (8A)
Yes (8A)
--
--
3380D
O
O
O
O
S
--
14-6
3380P
O
S
O
O
O
O
O
O
O
O
-Flexible
14-7
3380
Slot
4 wires VI
Current Gain
--
14-8
Selection Guide - SoC/Analog Test System - 1
DPS
HDDPS
PMU
VI45
PVI100
PAGE
V Range
±16V
±12V
±16V
±45V
±100V (±50V)
--
I Range
800mA
1A
250mA
100mA
2A (4A)
--
16
48
2
32
8
--
DPS
DPS
None
I/O slot
I/O slot
--
3650-CX
O
--
O
O
O
14-9
3650
O
--
O
O
O
14-11
3650-EX
--
O
O
O
O
14-13
ADDA
HDADDA
Fs Max
500KHz
500KHz
PAGE
--
16 Bit
16 Bit
--
1
32
--
None
I/O slot
--
3650-CX
O
--
14-9
3650
O
O
14-11
3650-EX
--
O
14-13
Channels
Slot
Selection Guide - SoC/Analog Test System - 2
Resolution
Channels
Slot
Selection Guide - SoC/Analog Test System - 3
DPS64
HCDPS
HDVI
PAGE
V Range
12V/±6V
±4V
70V ~ -40V
--
C Range
1A
32A
200mA
--
Channels
64
4
32
--
Slot
I/O slot
I/O slot
DPS
--
3680
O
O
O
14-15
HDAVO
HDADDA2
Sample Rate
400Msps
2Msps
PAGE
--
16 Bits
24 Bits
--
4
4
--
Slot
I/O slot
DPS
--
3680
O
O
14-15
Selection Guide - SoC/Analog Test System - 4
Resolution
Channels
S : Standard
O : Option
-- : None
14-1
All specifications are subject to change without notice.
Selection Guide - Final Test Handler - 1
Temperture condition
Ambient
High Temperature
(General Heater)
Hot
Tri-Temperature
(TEC Control)
ATC
High Temperature
(ATC : Active Thermal Control)
Passive cooling
(PTC : Passive Thermal Control)
PTC
Final Test
3110
O
O
O
O
O
O
3110-FT
O
--O
---
3180
O
O
O
----
3240-Q
O
-O
----
~135℃±2℃
O
--
--
--
<300W, <85℃
O
--
--
--
14-21
14-16
14-19
14-20
3160
O
O
O
----
3160A
O
O
O
----
3160C
O
O
O
O
O
O
3160F
O
------
~135℃±2℃
--
--
--
--
<300W, <85℃
--
--
--
--
14-17
14-17
14-18
14-17
Ambient
~150℃±3℃
~125℃±3℃
-40℃~125℃±2℃
-40℃~150℃±2℃
~-55℃
PAGE
Selection Guide - Final Test Handler - 2
Temperture condition
Ambient
High Temperature
(General Heater)
Hot
Tri-Temperature
(TEC Control)
ATC
High Temperature
(ATC : Active Thermal Control)
Passive cooling
(PTC : Passive Thermal Control)
PTC
Final Test
Ambient
~150℃±3℃
~125℃±3℃
-40℃~125℃±3℃
-40℃~150℃±3℃
~-55℃
PAGE
Selection Guide - System Level Test Handler
Temperture condition
Ambient
High Temperature
(General Heater)
Hot
Tri-Temperature
(TEC Control)
ATC
High Temperature
(ATC : Active Thermal Control)
Passive cooling
(PTC : Passive Thermal Control)
PTC
Ambient
~150℃±3℃
~125℃±3℃
-40℃~125℃±2℃
-40℃~150℃±2℃
~-55℃
3110
O
O
O
O
-O
System Level Test
3111
3240
O
O
--O
O
-------
3260
O
O
O
O
-O
~135℃±2℃
O
--
--
O
<300W, <85℃
O
--
--
O
14-21
14-22
14-23
14-24
PAGE
O : Option
-- : None
All specifications are subject to change without notice.
14-2
PXIe Digital IO Card
Model 33010
Systems Alliance
Interface, Test Data Output, Binning and Sequence
Control, Wafer Map, Summary Tool, and rich sets of
prober/handler drivers. The user debugging tools
include a Data Logger, Debug Plan, TCM, Shmoo,
Pattern Editor, Waveform, and more. A CAD to ATE
pattern conversion tool is also supported to cover
WGL/STIL/VCD/EVCD conversions.
KEY FEATURES
■ Standard PXIe-Hybrid [3U] compatible bus type
■ 100MHz maximum clock rate
■ 32 channels per board
■ Extendable up to 256 channels in one chassis
■ Any pin to any site
■ Per board sequencer architecture
(multiple time domains supported)
■ Per-pin timing with per-pin, per-cycle
bidirectional control
■ Per-pin time & frequency measurement
■ Per-pin DC level & PMU
■ 16 timing sets with on-the-fly timing changes
■ 64M sequencer command memory per pin
■ 64M vector memory per pin
■ SCAN pattern function support
■ Windows 7 operating system
■ LabView and LabWindows support
■ Proprietary CRAFT_PXI software tools option
■ Master / Slave architecture for boards chaining
■ Similar to pattern and timing structure as
3380D/3380P/3380 series ATE
APPLICATIONS
■ Semiconductor
■ LED / Laser Diode
■ Solar Cell
■ Battery / BMS
■ Transistor
■ Automotive
■ Avionics
■ Power Electronics
■ Sensor / IoT
Chroma 33010 is a high-density 100MHz PXIe
digital IO card designed for characterizing,
validating, and testing a variety of digital and
mixed-signal ICs. Each IO card consists of a
Sequencer Pattern Generator (SQPG) and 32
channels of full ATE-like features. The 33010 IO
card is expandable up to 256 channels. Some
unique features of the 33010 include an on-board
SQPG, per pin timing/levels/PMU/TFMU, multiple
time domains, and multi-threaded testing for
complex IC testing. Each channel is also equipped
with 64M vector memory, 16 timing sets with
on-the-fly timing change, and per pin timing and
frequency measurements up to 400 MHz.
Addressing the emerging market and test cost
challenges
W i t h a h i g h- d e n s i t y p e r p i n a n d p e r s i t e
architecture, full suite of ATE Pin Electronics (PE)
card functions, expandable channel count, and a
rich set of software support, the 33010 digital IO
card will help users address the emerging market
and test cost challenges. 33010 PXIe cards can be
easily adopted with other PXI/PXIe solutions such
as RF, SMUs, and Mixed-signal cards to address a
variety of applications such as MCUs, Sensors, RF
ICs, PMICs, or ICs with combined functions.
SPECIFICATIONS
Model
Clock Rate
Pin Channels per Card
Pattern Memory
Sequence Control Memory
Parallel Testing Capability
Timing Generator per Pin
Timing Generators
No. of Timing Sets
Rate Setting Resolution
Rate Setting Range
Driver / Comparator / Load
Pin Driver (Vil/Vih) Range
Pin Driver(Vil/Vih) Accuracy
Output Current Limit
Output Impedance
Pin Comparator (Voh/Vol) Range
Pin Comparator (Voh/Vol) Accuracy
Pin Load (Iol/Ioh) Range
Vref Setting Range
Scan Chains
Scan Chains Numbers
Scan Pattern Memory Size
PPMU
Channel
Voltage Force Range
Current Measured Range
Current Force Range
Voltage Measured Range
Time & Frequency Measurement
Maximum Frequency Measurement
Maximum Time Measurement
Free-run Clock
Others
System Environment
Programming Language
Power Consumption
Dimension
Optional PXIe Power Supply
Input Voltage (VAC)
Source Line Frequency Range
Input Current , Continuous (A)
Output Range (Vdc)
Output Current, Continuous (A)
Output Voltage Ripple Noise
Max. Support Watt
Occupy Slots
Proprietary Software, CRAFT_PXI and other
rich features of software support
I n a d d i t i o n t o L a b Vi e w a n d L a b Wi n d o w s
support, Chroma provides a proprietary software ORDERING INFORMATION
option, CRAFT_PXI, for Windows-based systems. 33010 : PXIe Digital IO Card
CRAFT_PXI contains a full set of production tools A330101 : PXIe Power Supply, 15V (option)
and user debugging tools. The production tools Demo Board) (option)
include ease-of-use GUI software with an Operator
33010
100 Mhz
32 pins (chained to max. 256 pins)
64M
64M
Any pin to any site
8 edges per pin (4 drive / 2 strobes / 2 IO markers)
16
625 pS
10ns to 5ms
-1.5V to +6V
±10mV
75 mA
50±5Ω
-1.5V to +6V
±10mV
±25mA
-1.5V to +6V
Configurable to 1, 2, 4, 8 chains per board
3G /1.5G / 768M / 384M
Per Pin (32 Chs FIMV / FVMI)
-2.0V to +6V
±2uA /±10uA / ±100uA / ±1mA / ±40mA
±2uA / ±10uA / ±100uA / ±1mA / ±40mA
-2.0V to +6V
Per pin, 400MHz
Per pin, 40 sec. (0.025Hz / resolution : 10ns)
Per Pin, Max. : 200MHz
Window 7
C \ C# \ Labview
80W
PXIe 3U
A330101 (AP15)
100 ~ 240 ±10% VLN
47 ~ 63Hz
0.1 ~ 2.7A
17.6~18.9 VDC ± 5%
11.2A
150mV
up to 200W (33010 x 4)
2 slots
PXIe Power Supply A330101
Programmable Pin Electronics Module
KEY FEATURES
■ Standard PXI compatible Bus type
■ 100MHz maximum data rate
■ 8 channels with per-pin, per-cycle
bidirectional control
■ Scalable architecture to provide up to 64-pin
■ 32M sequence command memory
■ More than 17 pattern sequence commands
■ Per-pin architecture
■ 32M vector memory per pin
■ 32 sets of clock and waveform per pin
■ Waveforms changes on-the-fly
■ Programmable tri-level driver in 610uV
resolution
■ One high voltage driver per board
■ Per-channel PMU
■ Per-channel timing measurement unit
■ Support scan pattern function
■ Windows 2000/XP operating system
■ Support LabView and LabWindows
■ Proprietary software tools option
APPLICATIONS
■ Logic and mixed signal validation and test
■ Digital pattern generator and vector capture
■ Consumer IC and electronics test
■ Logic test subsystem for DC and RF ATE
Model 36010
The 36010 is a 100MH z programmable pin
electronic module designed for characterizing,
validating and testing digital and mixed signal
IC or electronics. Each module consists of a
Sequence Pattern Generator and Logic Pin
Electronics Card containing 8 channels. The
36010 module is expandable to provide up to 64
channels hardware resource for various purposes.
Besides, based on the per-pin architecture, each
channel is equipped with 32M vector memory, 32
sets of clocks, 32 sets of waveforms and one PMU
channel. It provides fast and accurate testing, with
same performance and features as other stand
ATE equipment.
Sequence Pattern Generator
The Sequence Pattern Generator of the 36010
m o d u l e p rov i d e s m o re t h a n 17 s e q u e n ce
commands including "jump", "match", "loop",
"repeat" and etc. to control the flow of pattern
execution. It equips with 32M sequence command
memory, which allows each vector to has its own
sequence command to control the flow of pattern
execution flexibly. Besides, each Sequence
Pattern Generator can support up to 8 Logic Pin
Electronics Cards, which means it can support up
to 64 I/O channels and performs testing on 8 DUT
simultaneously.
Logic Pin Electronics Card
In each Logic Pin Electronics Card, it adopts
Chroma® PINF ICs on it to achieve high timing
accuracy and flexible waveform output functions.
The per-pin timing generator provides 32 sets
of clock containing 6 programmable edges. As
for the per-pin waveform generator, it provides
each digital I/O channel 32 sets of programmable
waveform with the change-one-the-fly feature. In
the analog function, the Logic Pin Electronics card
has the tri-level driver and comparator with 610uV
programmable resolution. It also equips with
active load, per-pin PMU and high voltage driver
functions. Moreover, the 36010 supports scan
pattern function for scan test.
Proprietary Software, CRISP
In addition to suppor t the LabView and
LabWindows environments, Chroma® also provides
the proprietary software option, CRISP. To cover
the various requirements for the IC debugging,
CRISP contains lots of software modules. Running
on the Microsoft Windows XP® operation system
and using C++ as the test program language,
CRISP provides users the flexible, easy-to-use and
fast-runtime GUI software to meet the various
demands. The project IDE tool makes it easy
to create the test program quickly. In the test
program debugging stage, CRISP provides the
suite of debugging software tools for user, which
includes Plan Debugger, Datalog, Waveform,
Scope, SHMOO, Pin Margin, Wafer Map, Summary,
Histogram, STDF, Test Condition Monitor, Pattern
Editor, and so on.
ORDERING INFORMATION
36010 : Programmable Pin Electronics Card
A360100 : Sequence Pattern Generator
A360101 : Load Board Test Fixture
A360102 : 250W/48V DC Power Supply
Universal Load Board
CRISP System Software
SPECIFICATIONS
Model
Test Rate
Channels Per Board
Vector Depth
Sequence Control Memory
Number of Sequence Control
Command
Parallel test capability
Timing Generator Per Pin
No. of Edges
No. of Timing Sets
Rate / Edge Setting Resolution
Rate Setting Range
Waveform Generator Per Pin
No. of Waveform Sets
Driver
VIL/VIH Range
VIL/VIH Accuracy
Output Current (Static/Dynamic)
Output Impedance
Comparator
VOL/VOH Range
VOL/VOH Accuracy
36010
50/100MHz
8 (Scalable to 64 channels)
32M
32M
17
8
6 edges / pin (2 Driver,
2 Driver & I/O, 2 Strobe)
32 sets / pin
125ps / 62.5ps
20nS → 1mS
32 sets / pin
-1.5V~+5.9V / -1.4V~+6V
±[email protected] ≧ VIL+200mV
±50mA/±100mA
50±5Ω
-1.5V ~ +6V
±15mV
Programmable Load
IOL/IOH Range
IOL/IOH Accuracy
VREF Setting Range
VREF Accuracy
High Voltage Driver
HV Channel
VIL/VIH Range
VIL/VIH Accuracy
VIL/VIH Output Current
Scan Chain
Chain number / LPC
Size per chain
PPMU
Channel Number
Voltage Force Range
Current Measured Range
Current Forced Range
Voltage Measured Range
Power and Dimensions
Power Consumption
Size
Cooling System
±12mA
±25uA
-1.5V ~ +6V
±50mV
1 HV channels / board
0V ~ +13.5V
±20mV
±60mA
Universal Load Board
1/2/4
256M/128M/64M
1 channel / 1 pin
-1.5V ~ +6V
32mA/2mA/200µA/20µA/2µA
32mA/2mA/200µA/20µA/2µA
-1.5V ~ +6V
25W per Slot
PXI 3U Standard Board
(Extendable)
Standard PXI Chassis Fan
(Forced Air Cooling)
Load Board Test Fixture
Four-quadrant DUT Power Supply
KEY FEATURES
■ 4 channels in a PXI compatible Bus type
■ +5V/-2V and +10V/-2V force ranges
■ 16-bit voltage force resolution
■ 18-bit current measurement resolution
■ 6 selectable ranges from 5uA to 250mA for
current measurement
■ Programmable current clamp function
■ Ganged function available for larger current
■ Board-to-board isolation
■ Windows 2000/XP operating system
■ Support LabView and LabWindows
■ Proprietary software tools for data analysis
APPLICATIONS
■ Logic and mixed signal validation and test
■ Consumer IC and electronics test
■ DUT Power Supply
The 36020 is a four-quadrant programmable DUT
power supply in a single-slot 3U PXI module.
Each 36020 features 4 channels with the ability
to source voltage and measure current. There
are two selectable voltage ranges, +5V/-2V and
+10V/-2V, with 16-bit resolution for programming
the voltage output. In order to provide better
accuracy, 36020 provides six selectable current
ranges including ±5μA, ±25μA, ±250μA,
±2.5mA, ±25mA and ±250mA with 18-bit
resolution for the current measurement
functionality. Moreover, the board-to-board
isolation design makes it possible to source the
larger voltage than 10V by the series connection
with multiple 36020 modules. The versatile supply
rails and high accuracy make 36020 an excellent
general-purpose, four-quadrant power supply
for design validation and manufacturing test
application. Especially, the extraordinary accuracy
in the small current measurement makes the
36020 very suitable for semiconductor IC test.
Power Supply with Precision Source and
Measurement Capability
The 36020 uses a combination of switching
and linear regulation to provide the excellent
voltage source and accuracy. It has the ability
to source voltage from each of its four outputs.
It can be programmed in 113μV steps on the
+5V/-2V range and 189μV steps on the +10V/-2V
channels. As a current measure unit, it can
measure in minimum 47.6pA resolution on each
channel in the ±5μA current range. You can use
this impressive level of current resolution in many
power supply applications.
Model 36020
Proprietary Software, CRISP
In addition to suppor t the LabView and
LabWindows environment, Chroma® provides
the front panel tool of the 36020 for users
to quickly troubleshoot or debug. Users can
m o n i to r o r re fe r t h e s e t t i n g o f t h e 36020
through this front panel tool. Besides, Chroma®
also provides the proprietary software option,
CRISP, for the 36020 to meet the demands of
users for various purposes. Based on Microsoft
W i n d o w s X P® o p e r a t i o n s y s t e m a n d C++
programming language, CRISP provides the
powerful, easy-to-use, intuitive, and fast-runtime
GUI tools for users. For the test debugging and
data analyzing purposes, CRISP provides users
the abundant software modules for the 36020,
including Datalog, SHMOO, Summary, Histogram,
STDF and Test Condition Monitor.
SPECIFICATIONS
Model
Input
Channel Number
Voltage Source
Range
Resolution
Accuracy
Noise
Current Measurement
Range
Resolution
250mA
25mA
2.5mA
Accuracy
250µA
25µA
5µA range
Slew Rate
Load Regulation
Load Transient
Time Response
Voltage Response
Overshoot/Undershoot
Clamp Flag Response
Clamp Resolution
Protection Function / Alarm Flag
Max Stable Load Capacitance
ORDERING INFORMATION
36020 : Four-quadrant DUT Power Supply
CRISP System Software
36020
PXI Internal Power
4
VR1: +10v/-2v
VR2: +5v/-2v
16bits
± 0.1%+4.64mV
3mVrms
±5µA, ±25µA, ±250µA, ±2.5mA, ±25mA, ±250mA
18bits
± 0.2%+200µA
± 0.15%+20µA
± 0.15%+2µA
± 0.15%+200nA+1nA/V
± 0.15%+150nA+1nA/V
± 0.15%+50nA+1nA/V
5v/25µs
2mV
100µs
50mv
<3%
100µs
10bits
Short current limit
Clamp alarm flag
100µF
VLSI Test System
Model 3380D
The Full Application Functions
Logic, ADDA, LCD, LED, Power, ALPG, Match, and etc.
MCU Device
Smart-card
All
Consumer IC
Chroma
3380D
ED driver IC
Power IC
(Class D..IC)
ADC/DAC Mixed-signal IC
3380D Linking for mass-production
C-M Kits : Compatible with 3360D/3360P
KEY FEATURES
■ 100 MHz clock rate
■ 50/100 MHz data rate
■ 256 I/O digital I/O pins
■ Up to 256 sites Parallel testing
■ 32/64/128M Pattern Memory
■ Various VI source
■ Flexible HW-architecture
(Interchangeable I/O, VI, ADDA,)
■ Real parallel Trim/Match function
■ Time & Frequency Measurement Unit (TFMU)
■ AD/DA test (16/24bits option)
■ SCAN test option (max 1G M/chain)
■ ALPG test option for embedded memory
■ STDF tools support
■ Test program/pattern converter
(J750, D10, S50, E320, SC312, V7, TRI-6020)
■ User friendly Windows 7 environment
■ CRAFT C/C++ programming language
■ SW (Software) Same as 3360 & 3360P
■ D-M Probe-card compatible with
3360P DM Probe-card
■ C-M DUT-card compatible with
3360D/3360P C-M DUT-card(FT/CP)
■ Direct mount fixture can be compatible with
3360P probe-Card
■ Cable mount fixture can be compatible with
3360D & 3360P
C-M FT/CP & D-M Kits : Compatible 3360P D-M probe card
3380D
(64 - 256 pins)
Lab-tool tester
(Engineering) &
mass-production
3380P
(128 - 576 pins)
Mass-production
& lab-tool tester
3380
(256 - 1280pins)
Mass-production
SPECIFICATIONS
Standard Specification
Clock Rate
Data Rate
Pin Channels
Pattern Memory
Parallel Testing Capability
EPA
Resource Per Pin Architecture
VI source
3380D Cable-Mount FT
/CP solution
3380D Direct-mount
CP solution
3380D
50/100 Mhz
50/100 Mbps
256 Pins
32M(S) / 64 & 128M (option)
256 DUTs
± 500ps
Yes
8CH : MXDPS,
16CH : MLDPS-16(S) / MXUVI / MXREF,
32CH : MLDPS
16 Channels /board
4 channels /board
Per Pin (FIMV/FVMI)
Per Pin
Per Pin
Per Pin
Windows 7
C/C++
PMU(± 48V, ± 100 mA )
HV-Pins driver ( +5.9V to +13.5V )
PPMU (-2V~+ 6V, ± 32 mA )
Programmable Active Load ( ± 12 mA)
TFMU (Time/Freq Measure unit:Max 400Mhz)
Free-run Clock ( Max: 200Mhz )
Windows Environment
Programming Language
3380D Test Option Specification
AD/DA Converter Test Option ( MXAWI/MXAWI2 )
4 AWG/ 4 DIG ( 16/24bits)
Mixed- Signal test option ( PXI )
24bits, 200MS/s
MXUVI ( DPS ± 12V, ± 1A, CG ± 4A )
16 Channels /board
MXDPS ( DPS ± 16V, ± 2A )
8 Channels /board
MXREF ( DPS ± 48V, ± 250mA, CG ± 1A )
16 Channels /board
MLDPS (DPS + 12V/± 500mA, ± 6V/± 1A , CG max ± 8 A ) 32 Channels /board
SCAN Option
1G bits/ chain
ALPG Memory Test Option
16X, 16Y, 16D /board
3380D System And Dimension
Power consumption Max
2KVA (VI Option to Max. 3KVA)
Test Head
W365 x D586 x H412 mm ( Max:45Kg)
Power Box
W220 x D372 x H187 mm ( Max:15Kg)
Note 1: “Cable-Mount" as standard, “Direct-Mount" as option.
VLSI Test System
Model 3380P
Most Flexible Configuration for Various Devices
MCU Device
All Consumer IC
ADC/DAC
Mixed-signal IC
Chroma
3380-P
LED Driver IC
Power IC
(LDO, Class D... IC)
Smart-card/RFID
CP/FT Direct/Cable Mount Solutions
CP/FT Direct/Cable Mount Solutions available from engineering to Production;
Maintain Compatibility to 3360 & 3360P
KEY FEATURES
■ 50/100 Mhz clock rate
■ 50/100 Mbps data rate
■ 512 digtial I/O pins ( Max 576 digtial I/O pins)
■ Up to 512 sites parallel testing
■ 16/32M pattern memory
■ Various VI source
■ Flexible HW-architecture
(Interchangeable I/O, VI, ADDA)
■ Real parallel trim/Match function
■ Time & Frequency Measurement Unit (TFMU)
■ AD/DA test option
■ SCAN test option (max 1G/chain)
■ ALPG test option for embedded memory
■ STDF tools support
■ Test program/pattern converter
(J750, D10, V50, E320, SC312, V7,
TRI-6020, ITS9K)
■ User friendly Windows 7 environment
■ CRAFT C/C++ programming language
■ Software same as 3360 & 3360-P
3380-P FT Direct-mount
3380-P CP Direct-mount
SPECIFICATIONS
Model
Clock Rate
Data Rate
I/O Channels
Pattern Memory
Parallel Testing Capability
EPA
Resource Per Pin Architecture
VI source
PMU(± 48V, ± 100 mA )
HV-Pins driver ( +5.9V to +13.5V )
PPMU (-2V~+ 6V, ± 32 mA )
Programmable Active Load ( ± 12 mA)
TFMU (Time/Freq Measure unit:Max 400Mhz)
Free-run Clock ( Max: 200Mhz )
Windows Environment
Programming Language
Test Option
AD/DA Converter Test Option
Mixed- Signal test option ( PXI )
MXUVI (DPS ±12V, ± 1A, CG max : ±4A)
MXDPS (DPS -8V~+16V, ±2A )
MXREF (DPS ±48V, ±250mA, CG max : ±1A)
MLDPS (DPS +12V/±500mA,±5V/±1A, CG max : ±4/8A)
SCAN Option
ALPG Memory Test Option
System And Dimension
Power Consumption
Only Test Head
* Note 1: "Direct-Mount" as Standard, "Cable-Mount" as Option
3380P
50 / 100Mhz
50 / 100Mbps
512 Pins ( Max:576Pins)
16M / 32M(Option) 2X: 32M / 64M(option)
512 DUTs
± 500ps
Yes
8CH: MXDPS,
16CH: MXUVI/MXREF,
32CH: MLDPS
16 Channels /board
4 channels /board
Per Pin (FIMV/FVMI)
Per Pin
Per Pin
Per Pin
Window 7
C\C++
Specification
4 AWG / 4 DIG (16 bits)
24bits, 200MS/s
16 Channels /board
8 Channels /board
16 Channels /board
32 Channels /board
1G bits/ chain
16X, 16Y, 16D /board
Max : 3KVA
W640xD470XH639 mm ( Max:100Kg)
VLSI Test System
Model 3380
Rich Functions and Wide Coverage : Logic, MCU, ADDA (Mixed-signal); Power, LED
driver, Class D; CIS, SCAN, ALPG, Match..etc
MCU Device
ADC/DAC
Mixed-signal IC
LED Driver IC
Smart-card
All Consumer IC
Chroma
3380
Power IC
(Class D... IC)
CIS
CP/FT Direct mount solutions available from engineering to production;
CP maintain compatibility to J750
KEY FEATURES
■ 50/100 MHz clock rate
■ 50/100 Mbps data rate
■ 1024 I/O pins (Max :1280 I/O pins)
■ Up to 1024 sites Parallel testing
■ 32/64 M pattern memory
■ Various VI source
■ Flexible HW-architecture
(Interchangeable I/O, VI, ADDA,)
■ Real parallel trim/match function
■ Time & frequency measurement unit (TFMU)
■ High-speed time measurement unit (HSTMU)
■ AD/DA test option
■ SCAN test option (max 1G M/chain)
■ ALPG test option for embedded memory
■ STDF tools support
■ Test program/pattern converter (J750, D10,
V50, E320, SC312, V7, TRI-6020, ITS9K)
■ User friendly windows 7 environment
■ CRAFT C/C++ programming language
■ SW (Software) same as 3380P & 3360P
3380 FT Direct-mount
3380 CP Direct-mount (compatibility with J750)
SPECIFICATIONS
Model
Clock Rate
Data Rate
I/O Channels
Pattern Memory
Parallel Testing Capability
EPA
Resource Per Pin Architecture
VI source
PMU (± 48V, ± 100 mA )
HV-Pins driver ( +5.9V to +13.5V )
PPMU (-2V~+ 6V, ± 32 mA )
Programmable Active Load ( ± 12 mA)
TFMU (Time/Freq Measure unit:Max 400Mhz)
Free-run Clock ( Max: 200Mhz )
Windows Environment
Programming Language
3380 Test Option
AD/DA Converter Test Option
Mixed- Signal test option ( PXI )
MXUVI (DPS ±12V, ± 1A, CG max : ±4A)
MXDPS (DPS -8V~+16V, ±2A )
MXREF (DPS ±48V, ±250mA, CG max : ±1A)
MLDPS (DPS +12V/±500mA,±5V/±1A, CG max : ±4/8A)
SCAN Option
ALPG Memory Test Option
System And Dimension
Power Consumption
Test Head
Main Frame
* Note *1: "Direct-Mount" as Standard
3380
50 / 100Mhz
50 / 100Mbps
1024 Pins ( Max:1280 Pins)
16M / 32M (Option)2X: 32M / 64M (option)
1024 DUTs
± 500ps
Yes
8CH : MXDPS,
16CH : MXUVI/MXREF,
32CH : MLDPS
32 Channels
4 channels /board
Per Pin (FIMV/FVMI)
Per Pin
Per Pin
Per Pin
Window 7
C\C++
Specification
4 AWG / 4 DIG (16 bits)
24bits, 200MS/s
16 Channels /board
8 Channels /board
16 Channels /board
32 Channels /board
1G bits/ chain
16X, 16Y, 16D /board
Max : 8KVA
W714 x D717 x H458 mm ( Max : 165Kg)
W766 x D700 x H1562 mm ( Max : 160Kg)
SoC/Analog Test System
Model 3650-CX
Chroma 3650-CX brings you the low cost and
high performance test solution
3650-CX adopts the all-in-one design to provide
a compact size ATE with very low cost, high
accuracy and high throughput for customers
to save the cost and raise the profit. With the
versatile test capabilities and powerful software
tools, 3650-CX is designed for MCU, NAND flash
controllers, the peripheral devices of PC, switch
devices, LED driver ICs, power ICs and consumer
SoC devices.
KEY FEATURES
■ 50 / 100MHz; 200Mhz (MUX) Clock Rate
■ 50 / 100Mbps; 200 Mbps (MUX) Data Rate
■ Up to 256 digital I/O pins
■ 16/32 (option) MW vector memory
■ 16/32 (option) MW pattern instruction
memory
■ Per-pin timing/PPMU/frequency
measurement
■ Up to 4-32 16-bit ADDA channels option
■ SW configurable scan chains in 1024M
depth or up to 32 scan chains/board
■ ALPG option for memory test
■ Up to 16 high-voltage pins
■ 16 high-performance DPS channels
■ Overall timing accuracy < ±550ps
■ 8 ~ 32-CH / board for VI45 analog option
■ 2 ~ 8-CH / board for PVI100 analog option
■ Microsoft Windows® XP OS
■ C++ and GUI programming interface
■ CRISP, full suite of intuitive software tools
■ Air-cooled, All-in-one design and
space-saving footprint
■ Cable mount / Direct mount
APPLICATIONS
■ MCU/MCU + Embedded
Memory
■ NAND Flash Controller
■ PC I/O
■ Switch ICs
■ Smart Power Management
Devices
■ Mixed Signal, Digital and
Analog ICs
■ ADC/DAC/CODEC ICs
■ Consumer ICs
■ Engineering, Wafer Sort and
Final Test
■ Power ICs
■ LED Driver ICs
STB
LED Driver ICs
Power ICs
PC I/O
Chroma 3650-CX
TCON/
LCD Controller
Consumer IC
SoC
High Performance
MCU
CRISP, the powerful system software for
3650-CX
The 3650-CX features powerful suite of software
tools using Chroma Integrated Software
Platform, CRISP. It not only provides the rapid
test developing functions, CRISP also covers
all needs for test debugging, production and
data analysis. Base on the Microsoft Windows
XP® operation system and C++ programming
language, CRISP provides powerful, easy-to-use,
intuitive and fast-runtime GUI tools for users. The
CRISP includes test plan debugger, pattern editor,
waveform tool, scope tool, pin margin, Shmoo,
wafer map, histogram, STDF tool, datalog and etc.
All-in-one design and compact size to save the
floor space
With the air-cooled and zero footprint testerin-a-test-head design, 3650-CX delivers high
throughput in a highly integrated package
for minimum floor space. With an optional
manipulator, 3650-CX can be used in both
package and wafer sort test.
Peripheral
The 3650-CX provides multiple drivers for
communications with handler and prober by
GPIB and TTL interface. The supported handlers
or probers include SEIKO-EPSON, SHIBASOKU,
MULTITEST, ASECO, DAYMARC, TEL, TSK and OPUS
II, and so forth.
SoC/Analog Test System
SPECIFICATIONS
Model 3650-CX
Clock Rate
Data Rate
Pattern Memory Size
Overall Timing Accuracy
Software /Programming Language / OS
Pin Electronics Board
IO Channels
Vector Depth
Drive VIL / VIH
Maximum Driver Current
Comparator VOL / VOH
Compare Modes
EPA (Drive / IO / Compare)
Dynamic Load Current
Timing Sets
Timing Edges
Rate / Edge Resolution
Waveform Sets
Waveform Format
Utility Pin Relay Control
PPMU/Frequency Measurement Unit (OSC)
DUT Power Supply
Channels
Voltage Range
Maximum Output Current
Current Gang Channels
Precision Measurement Unit
Channels
Voltage Range
Current Range
Options
ADDA/HD-ADDA
Channels
AWG / Digitizer
Resolution / Max. Conversion Rate
Voltage Range
Algorithm Pattern Generator (ALPG)
Scan
VI45
Channels
Voltage / Current Range
Current Ganged Channels
TMU
PVI100
Channels
Voltage / Current Range
Current Ganged Channels
TMU
System and Dimension
Power Consumption
Cooling System
Frame Size
Weight
Model 3650-CX
50 / 100Mhz; 200Mhz (MUX mode)
50 / 100Mbps; 200Mbps (MUX mode)
16 / 32M (Option)
±550ps (Window), ±450ps (Edge)
CRISP/ C++ / Windows XP
LPC
64-pin / Board X 4 Boards / System
16 / 32M per pin
-2 ~ +6V / -1.9 ~ +7V
50mA (static) / 100mA (dynamic)
-2 ~ +7V
Edge, Window
±300ps / ±300ps / ±300ps
±35mA
32 sets per pin
6 (2 Drive, 2 Drive & IO, 2 Compare)
125 / 62.5ps
32 sets per pin
4096 Timing-Waveform Combination Changes on-the-fly
64 (8 / Board), 128 bit relay board option available
per pin
DPS
16-CH / Board X 1 Boards / System
±8V, ±16V
0.8A / 1-CH
8
PMU
2-CH / Board X 4 Boards / System
±2.5V, ±8V, ±16V
±800nA ~ ±250mA
1 ADDA CH / LPC or 32 CH HD-ADDA / board
per channel
ADDA: 16-bit / 500KHz ; HD-ADDA: 16 Bit 500KHz
±2.5V / ±4.5V / ±9V
X = 16, Y = 16 / D = 16
1 / 2 / 4 / 8 / 16 / 32 scan chains, Max 1024M depth
8 ~ 32-CH / Board
±45V / ±100mA
4 buses for 8 channels, x2 – x8, 800mA max
per channel
2 ~ 8-CH / Board
±100V / ±2A , ±50V / ±4A
x2 – x8, 32A max
per channel
3.5KW Max
Forced Air Cooling
L 643 x W369 x H 760 mm
130Kg
SoC/Analog Test System
50/100 MHz
KEY FEATURES
■ 50 / 100MHz; 200Mhz (MUX) Clock Rate
■ 50 / 100Mbps; 200Mbps (MUX) Data Rate
■ Up to 512 digital I/O pins
■ 16/32 (option) MW vector memory
■ 16/32 (option) MW pattern instruction memory
■ Per-pin timing/PPMU/frequency measurement
■ Up to 8-32 16-bit ADDA channels option
■ SW configurable scan chains in 1024M depth or
up to 32 scan chains/board
■ ALPG option for memory test
■ Up to 32 high-voltage pins
■ 32 high-performance DPS channels
■ Overall timing accuracy < ±550ps
■ 8 ~ 32-CH / board for VI45 analog option
■ 2 ~ 8-CH / board for PVI100 analog option
■ MRX option for 3rd party PXI instruments
■ Microsoft Windows® XP OS
■ C++ and GUI programming interface
■ CRISP, full suite of intuitive software tools
■ Test program and pattern converters for
other platforms
■ Accept DIB and probe card of other testers
directly
■ Support STDF data output
■ Air-cooled, small footprint tester-in-a-test-head
design
Chroma 3650 brings you the most
cost-effective SoC tester
C h ro m a 3650 i s a n S o C te s te r w i t h h i g h
throughput and high parallel test capabilities
to provide the most cost-effective solution
for fabless, IDM and testing houses. With the
full functions of test, high accuracy, powerful
s o f t w a re t o o l s a n d e xc e l l e n t re l i a b i l i t y,
3650 has the versatile test capabilities for
high-per formance microcontroller, analog
IC, consumer SoC devices, and wafer sor t
applications.
STB
LED Driver ICs
Power ICs
PC I/O
TCON/
LCD Controller
Chroma 3650
Consumer IC
SoC
High Performance
MCU
Model 3650
High performance in a low-cost production
system
The 3650 achieves lower test cost not only by
reducing the cost of tester system but also by
testing more devices faster and the high parallel
test capability. With the Chroma PINF IC and
the sophisticated calibration system, 3650 has
the excellent overall timing accuracy within
±550ps. The pattern generator of 3650 has up
to 32M pattern instruction memory. By having
the same depth as the vector memory, Chroma
3650 allows to add pattern instruction for each
vec tor. Moreover, the power ful sequential
pattern generator provides the variety of pattern
commands to meet the demands of complex test
vectors. The true test-per-pin architecture and the
flexible site mapping with no slot boundaries are
designed for multi-site test with high throughput.
Up to 512 digital pins, 32 device power supplies,
per-pin PMU and the analog test capability, 3650
delivers a combination of high test performance
and throughput with cost-effective test solution.
High parallel test capability
The powerful, versatile parallel pin electronics
resources of 3650 can simultaneously perform
identical parametric tests on multiple pins.
The 3650 integrates 64 digital pins onto one
single LPC board. In each LPC board, it contains
16 high performance Chroma PINF ICs which
s u p p o r t s 4 4 c h a n n e l s t i m i n g g e n e r a t o r.
The integration of local controller circuitr y
manages resources setup and result readout,
and therefore cuts the overhead time of the
system controller. With the any-pin-to-any-site
mapping design,3650 provides up to 32 sites high
throughput parallel testing
capabilities to enlarge
the mass production
per formance with more
flexible and easy layout.
CP Docking Solution for other Tester Platform
Powerful suite of software tools – CRISP
The 3650 features the powerful suite of software
tools using Chroma Integrated Software
Platform, CRISP. Not only provides the rapid test
development function, CRISP covers all needs for
test debugging, production and data analysis.
The CRISP integrates the software functions
of test development, test execution control,
data analysis and tester management together.
Based on the Microsoft Windows XP® operation
system and C++ programming language, CRISP
provides the powerful, easy-to-use, intuitive, and
fast-runtime GUI tools for users. In the Project
IDE tool, test developer can easily shift between
standard template, user-defined template and C++
code-based editor to create their test program
quickly and automatically scale to multi-site for
parallel test. Besides, CRISP also provides the test
program and test pattern converters to facilitate
the test conversion from other tester platforms to
3650.
For the test program execution controller, user can
select the System Control tool or Plan Debugger
tool for normal mode or debugging mode. In
the Plan Debugger tool, user can control the
execution of test program by setting break point,
step, step-into, step-over, resume execution,
variable-watch and variable-modify, etc. For the
test debugging and data analyzing purposes, 3650
provides abundant software utility tools. Datalog,
Waveform and Scope tools are designed to
support the measured data and digital waveform
display. To find the parametric margin, SHMOO and
Pin Margin tools can easily accomplish debug
64 channel Digital Pin Card
Flexibility
The semiconductor industry is a fast moving one,
and capital equipment
must be built to outlive several device generations
and applications. With varieties of available
options, such as AD/DA converter test, ALPG for
memory test, high voltage PE, multiple scan chain
test, VI45 & PVI100 analog options, Chroma 3650
makes sure that it will serve you for years to come.
Moreover, Chroma 3650 platform architecture
allows development of focused instruments by
third-party suppliers that can be easily added for
specific applications. It can stretch the boundaries
of test by covering a broader range of devices
than ever before possible in a low-cost production
test system.
System Control
Test Program Debugger
SoC/Analog Test System
Model 3650
Application support
Chroma offers the application support solutions to its new and established customers to
accurately meet user needs. On request Chroma can provide customized support designed
around your specific needs. Whether you need ramp up production, want to capitalize on
emerging market opportunities, enhance productivity, lower testing costs with innovative
strategies, Chroma worldwide customer support staff is committed to generate timely and
efficient solution for you.
Scope Tool
Channel Debugger
by auto-mode or manual-mode execution. Besides,
the Wafer Map, Summary, Histogram and STDF tools
are very helpful and powerful for collecting the test
results and analyzing the parametric characterization.
As for the Test Condition Monitor and Pattern Editor
tools, they provide the superior functions for run-time
debugging to change the test conditions or pattern
data without breaking the test or modifying the source
files. Besides, CRISP also prepares the ADDA tool and
Bit Map tool for the analog and ALPG option. Using the
ADDA tool, user can not only see the AD/DA test result
by graphic tool, user can also create the ADC pattern
easily.The full suite of powerful GUI tools will definitely
meet the various purposes for test debugging and test
report.
The OCI to o l is t h e so lut io n of C RI S P for ma s s
production.Easy-and-correct operation is the most
important request for production run. Programmer
can customize the setup of OCI tool by the Production
Setup tool to meet the production environment
requirement in advance. Then, what an operator has to
do is just to select the planned process to start the mass
production.
Peripheral
The 3650 provides multiple drivers for communications
with handler and prober by GPIB and TTL interface. The
supported handlers or probers include SEIKO-EPSON,
SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK
and OPUS II, and so forth. In addition to provide the
convenient converter tools for test platform migration,
3650 provides the adaptor board solution for existed
tester platform to save the cost of users. Through
theadaptor board solution, Chroma 3650 can accept the
DIB and probe card of other testers directly to save the
cost for making the new load boards and probe cards.
Small footprint
With the air-cooled and small footprint tester-in-atest-head design, 3650 delivers high throughput in a
highly integrated package for minimum floor space.
A mainframe cabinet contains the power distribution
units and the space for third-party instruments. With
an optional manipulator, 3650 can be used in both
package and wafer test.
SPECIFICATIONS
Model
Clock Rate
Data Rate
Pattern Memory Size
Overall Timing Accuracy
Software /Programming Language / OS
Pin Electronics Board
IO Channels
Vector Depth
Drive VIL / VIH
Maximum Driver Current
Comparator VOL / VOH
Compare Modes
EPA (Drive / IO / Compare)
Dynamic Load Current
Timing Sets
Timing Edges
Rate / Edge Resolution
Waveform Sets
Waveform Format
Utility Pin Relay Control
PPMU/Frequency Measurement Unit
(OSC)
DUT Power Supply
Channels
Voltage Range
Maximum Output Current
Current Gang Channels
Precision Measurement Unit
Channels
Voltage Range
Current Range
Options
ADDA
Channels
AWG / Digitizer
Resolution / Max. Conversion Rate
Voltage Range
Algorithm Pattern Generator (ALPG)
Scan
VI45
Channels
Voltage / Current Range
Current Ganged Channels
TMU
PVI100
Channels
Voltage / Current Range
Current Ganged Channels
TMU
MRX
No of slots
Instruments
System and Dimension
Power Consumption
Test Head Dimension (L X W X H)
Mainframe Dimension (L X W X H)
3650
50 / 100Mhz; 200Mhz (MUX mode)
50 / 100Mbps; 200Mbps (MUX mode)
16 / 32M (Option)
±550ps (Window), ±450ps (Edge)
CRISP/ C++ / Windows XP
LPC
64-pin / Board X 8 Boards / System
16 / 32M per pin
-2 ~ +6V / -1.9 ~ +7V
50mA (static) / 100mA (dynamic)
-2 ~ +7V
Edge, Window
±300ps / ±300ps / ±300ps
±35mA
32 sets per pin
6 (2 Drive, 2 Drive & IO, 2 Compare)
125 / 62.5ps
32 sets per pin
4096 Timing-Waveform Combination Changes on-the-fly
64 (8 / Board), 128 bit relay board option available
per pin
DPS
16-CH / Board X 2 Boards / System
±8V, ±16V
0.8A / 1-CH
8
PMU
2-CH / Board X 8 Boards / System
±2.5V, ±8V, ±16V
±800nA ~ ±250mA
1 ADDA CH / LPC or 32 CH HD-ADDA / board
per channel
ADDA: 16-bit / 500KHz ; HD-ADDA: 16 Bit 500KHz
±2.5V / ±4.5V / ±9V
X = 16, Y = 16 / D = 16
1 / 2 / 4 / 8 / 16 / 32 scan chains / LPC maximum 1024 /
2048M scan depth
8 ~ 32-CH / Board
±45V / ±100mA
4 buses for 8 channels, x2 – x8, 800mA max
per channel
2 ~ 8-CH / Board
±100V / ±2A , ±50V / ±4A
x2 – x8, 32A max
per channel
Mixed Resource BoX
10 slots per chassis (max 2 chassis)
PXI-based instruments
5.5KW / forced air cooling
800 X 744 X 612 mm
850 X 850 X 1680 mm
SoC/Analog Test System
Model 3650-EX
Flexibility
Semiconductor manufacturing is a fast moving
industry; more and more devices are highly
integrated with various func tions. Capital
equipment must be built to outlive several device
generations and applications. With varieties
of available options, such as AD/DA converter
test, ALPG for memory test, high voltage PE,
multiple scan chain test, VI45 & PVI100 analog
test options and HDADDA mixed-signa l test
options, Chroma 3650-EX can provide a wide
coverage for customer to test different kind of
devices with flexible configurations. Moreover,
Chroma 3650-EX platform architecture allows
development of focused instruments by thirdparty suppliers that can be easily added for
specific applications. It can stretch the boundaries
of test by covering a broader range of devices
than ever before possible in a low-cost production
test system.
KEY FEATURES
■ 10 interchangeable slots for digital, analog and
mixed-signal applications
■ 50/100 MHz clock rate, 100/200 Mbps data rate
■ Up to 512 sites parallel test
■ Up to 1024 digital I/O pins
■ 32/64 MW vector memory
■ Up to 32 CH PMU for high precision
measurement
■ Per-pin timing/ PPMU/ frequency
measurement
■ Scan features to 4G depth / 32 scan chains
■ ALPG option for memory test
■ Switching timing accuracy ±300ps
■ Up to 64 CH high-voltage pins
■ 96 CH high density DPS
■ 32 CH HDADDA mixed-signal option
■ 8~32 CH VI45 analog option
■ 2~8 CH PVI100 analog option
■ MRX option for 3rd party PXI/PXIe applications
■ Microsoft Windows® 7 OS
■ C++ and GUI programming interface
■ CRISP, full suite of intuitive software tools
■ Test program and pattern converters for other
platforms
■ Accept DIB and probe card of other testers
directly
■ Support STDF data output
■ Air-cooled, small footprint tester-in-a-test-head
design
High parallel test capability
The powerful, versatile parallel pin electronics
resources of 3650-EX can simultaneously perform
identical parametric tests on multiple pins.
3650-EX integrates 128 digital pins into one slot.
In each LPC board, it contains high performance
Chroma PINF ICs which suppor ts timing
generation. The integration of local controller
circuitry manages resources setup and result
readout, and therefore cuts the overhead time of
the system controller. With the any-pin-to-anysite mapping design, 3650-EX provides up to 512
sites high throughput parallel testing capabilities
to enlarge the mass production performance with
more flexible and easy layout.
provides the powerful, easy-to-use, intuitive, and
fast-runtime GUI tools for users. In the Project
IDE tool, test developer can easily shift between
standard template, user-defined template and C++
code-based editor to create their test program
quickly and automatically scale to multi-site for
parallel test. Besides, CRISP also provides the test
program and test pattern converters to facilitate
the test conversion from other tester platforms to
3650-EX.
Shmoo tool
128-Channel
Logic Pin Card
48-Channel High Density
Device Power Supply
TCM tool
System Control
Powerful suite of software tools – CRISP
3650-EX features the powerful suite of software
tools using Chroma Integrated Software
Platform(CRISP). Not only provides the rapid
test development function, CRISP covers various
tools for test debugging, production and data
analysis. CRISP integrates software functions of
test program development, test execution control,
data analysis and tester management together.
Based on the Microsoft Windows 7® operation
system and C++ programming language, CRISP
Scope Tool
SoC/Analog Test System
Chroma 3650-EX brings you the most
cost-effective SoC tester
Chroma 3650-EX is specifically designed for
high-throughput and high parallel test capabilities
to provide the most cost-effective solution
for fabless, IDM and testing houses. With the
full functions of test capability, high accuracy,
powerful software tools and excellent reliability,
3650-EX is ideal for testing consumer devices,
high-performance microcontrollers, analog devices
and SoC devices.
From design to production
Chroma 3650-EX build-in MRX solution can
suppor t PXI instrumentation which can
p rov i de use rs wi der cove ra ge to d ifferent
kind of applications. For those users use PXI
instrumentation for their design validation and
verification, they can move PXI instrumentation
directly to 3650-EX for production. There will be
less uncorrelated issues happened on design
stage and production by using the same PXI
instrumentation. Chroma 3650-EX had successfully
integrated several PXI solutions like Audio,
Video and RF applications not only on hardware
integration, also for build-in libraries and tools in
software to help users control PXI instrumentation
more easily and enable accelerated test program
development, reducing product time to market.
Model 3650-EX
SPECIFICATIONS
Model
Digital IO Channels
Test Speed
Multi-site Test Capability
Software / Programming language/
Operating System
Logic Pin Card
IO Channels
Pattern Memory
Drive VIL / VIH
Maximum Drive Current
Comparator VOL / VOH
Comparator Modes
EPA (Drive / IO / Compare)
Dynamic Load Current
High Voltage Driver
Timing Edges
Rate / Edge resolution
Utility Pin Control
SCAN
Algorithm Pattern Generator (ALPG)
Precision Measurement Unit
Number of channels
Voltage Range
Current Range
Device Power Supply
Number of channels
Voltage Range
Maximum Output Current
Current Gang Channels
Mixed-signal options
Number of channels
Sampling Rate
Resolution
Voltage Range
Analog Options
Number of channels
Voltage / Current Range
Current Ganged Channels
AWG / DVM / TMU
Analog Options
Number of channels
Voltage / Current Range
Current Ganged Channels
AWG / DIG / DVM / TMU
Mixed-signal and RF Box
Number of slots
System and Dimension
Power consumption / Cooling
Test Head Dimension (L x W x H)
Mainframe 2 Dimension (L x W x H)
3650-EX
1024 Channels
50/100MHz (2/4 Edges), 200MHz (Mux)
Maximum 512 sites
CRISP / C++ / WINDOWS 7
HDLPC
64 / 128 CH per board
32 / 64M vector Depth
-1.5 ~ +6.4V/-1.4 ~ +6.5V
50mA (static) / 100mA (dynamic)
-1.5 ~ +6.5V
Edge, Window
±300ps / ±300ps / ±300ps
±25mA
4 channels per 64 IO / 0V ~ 15V, maximum 64 CH per
system
6 (2 Drive, 2 Drive & IO, 2 Compare)
125ps / 62.5ps
8 utility bits per 64 IO, maximum 128 bits per system
1 / 2 / 4 / 8 / 16 / 32 scan chains, maximum 4G depth
X = 16, Y = 16 / D = 16
PMU
2 CH per 64 IO / maximum 32 CH per system
±2.5V, ±8V, ±16V
±800nA ~ ±250mA
HDDPS
48 CH per board / maximum 96 CH per system
±6V, ±12V
1A / 6V, 500mA / 12V
x2 ~ x6, Maximum 6A
HDADDA
32 CH per board / maximum 64 CH per system
500 KHz
16 Bit
±2.5V / ±4.5V / ±9V
VI45
8~32 CH per board
±45V / ±100mA
x2 ~ x8, 800mA maximum
1~4 CH AWG / 1~4 CH DVM / 8~32 CH TMU
PVI100
2~8 CH per board
±100V / ±2A , ±50V / ±4A
x2 ~ x8, 32A maximum
2~8 CH AWG / 2~8 CH DIG / 2~8 CH DVM / 2~8 CH TMU
MRX
18 PXI / PXIe compatible slots
Maximum 10.8KW / Forced air cooling
800 x 744 x 806 mm
680 x 352 x 730 mm
SoC/Analog Test System
Model 3680
Semiconductor manufacturing is a fast moving
industry; more and more devices are highly
integrated with var ious func tions. Capital
equipment must be built to outlive several
device generations and applications. Chroma
3680 can provide a wide coverage for customer
to test different kind of devices with flexible
configurations.
C h r o m a 3680 i s s p e c i f i c a l l y d e s i g n e d f o r
high-throughput and high parallel test capabilities
to provide the best solution for fabless, IDM and
testing houses. With the full functions of test
capability, high accuracy, powerful software tools
and excellent reliability, Chroma 3680 is ideal
for testing consumer devices, high-performance
microcontrollers, analog devices and SoC devices.
KEY FEATURES
■ 25 interchangeable slots for digital, analog and
mixed-signal applications
■ 250 Mbps up to 1Gbps data rate
■ Up to 512 sites parallel test
■ Up to 2048 digital I/O pins
■ 256 MW vector memory (512 MW option)
■ Up to 32 CH PMU for high precision
measurement
■ Per-pin timing/ PPMU/ frequency measurement
■ Scan features to 16G depth/scan chains
■ Switching timing accuracy ±150ps
■ Up to 128 CH High density DPS32
■ High density HDADDA2 mixed-signal option*
■ High density HDVI analog option*
■ Efficient high power HCDPS analog option*
■ High performance HDAVO option*
■ Microsoft Windows 10 OS
■ C#.NET and GUI programming interface
■ CRISPro, full suite of intuitive software tools
■ Test program and pattern converters for other
platforms
■ Accept DIB and probe card of other testers
directly
■ Support STDF data output and customized
data format
■ Air-cooled, small footprint tester-in-a-test-head
design
* Call for availability
APPLICATIONS
■ Microcontroller Unit (MCU)
■ Digital Audio
■ Digital TV (DTV)
■ Set Top Box (STB)
■ Digital signal processing (DSP)
■ Network Processor and Field Programmable
Gate Array (FPGA)
Shmoo Tool
Wafer Diagram Tool
SPECIFICATIONS
Model
Digital IO Channels
Date Rate
Multi-site Test Capability
Software
Programming language
Operating System
Logic Pin Card
IO Channels
Pattern Memory
Drive VIL / VIH
Maximum Drive Current
Comparator VOL / VOH
Comparator Modes
EPA (Drive / IO / Compare)
Dynamic Load Current
External High Voltage Driver
High Voltage Driver
Timing Edges
Rate / Edge resolution
Utility Pin Control
SCAN
Precision Measurement Unit
Number of channels
Voltage Range
Current Range
Device Power Supply
Number of channels
Voltage Range
Maximum Output Current
Current Gang Channels
System and dimension
Power consumption / Cooling
Test Head Dimension (L x W x H)
Mainframe Dimension (L x W x H)
3680
2048 Channels
250Mbps, up to 1Gbps
512 sites
CRISPro
C#.NET
Windows® 10
LPC128
128 CH per board
256 / 512M(option) vector depth
-1.5 ~ +6.4V/-1.4 ~ +6.5V
50mA (static) / 100mA (dynamic)
-1.5 ~ +6.5V
Edge, Window
±150ps / ±150ps / ±150ps
±25mA
8 CH per 18V, maximum 192 CH per system
13.5V, 32 CH per instrument board
6
50ps / 12.5ps
8 utility bits per 64 IO, maximum 256 bits per system
1 / 2 / 4 / 8 / 16 / 32 scan chains, maximum 16G depth
PMU
1 CH per 32 IO
±2.5V, ±8V, ±24V
±800nA ~ ±250mA
DPS32
32 CH per board / maximum 128 CH per system
-6V~+6V, -6V~+12V
1A / 6V, 500mA / 12V
x2 ~ x32, Maximum 32A
14.4KW / Forced air cooling
900 x 744 x 706 mm
802 x 596 x 1018 mm
ORDERING INFORMATION
3680 : SoC/Aanlog SoC/Analog Test System
Full Range Active Thermal Control Handler Model 3110-FT
SPECIFICATIONS
Model
Dimensions (WxDxH)
Weight
Facility
Applicable Device
Category
Contact Method
Contact Force
Temperature Range
KEY FEATURES
■ Temperature Test from -40~125˚C
■ Final Test
■ 3x3 mm~45x45 mm Package
■ Contact Force Control 1~10 kg (Optional)
■ Up to 4 Output Trays
■ Remote Control Operation
■ Yield Monitor
■ Intelligent Auto Retest & Auto Retry
■ Real-time Tray Status
Ideal for characterization and test development,
the Chroma 3110-FT is an innovative pick & place
system for IC testing in Final Test. The system is
capable of handling a vast variety of device types
and sizes ranging from 3x3 mm to 45x45 mm. To
further increase productivity, the 3110-FT offers
an optional remote control function allowing
operation of the handler from any location with an
internet connection. Equipped with 2 auto output
tray stacks and 2 manual output trays, the 3110-FT
will maximize the loading and unloading capacity
to save cost and time all within a 1.4 m² floor
space.
Rotator
Interface
Index Time
Jam Rate
3110-FT
1000 mm x 1350 mm x 1900 mm (signal tower excluded)
900 kg
Power : AC200V, Single Phase, 50/60Hz, 8.8 KVA Max.
Compressed Air : 0.5 MPa or higher (dray and clean air)
Flow Rate : 800 L/min, constant supply
Type : QFP, SOP, TSSOP, QFN, BGA
Package Size : 3x3 mm to 45x45 mm
Package Height : 0.5 mm to 5 mm
Lead / Ball pitch : 0.5 mm / 0.4 mm and above
4 categories (2 auto, 2 manual)
Direct Contact / Drop and Press
50 kgf (standard)
1 to 10 kgf, ±10% (optional)
-40~125˚C (contact head accuracy ±2˚C,
Pre-soak and Post-recovery buffer accuracy ±10˚C)
±90°
Standard : RS-232,TCP/IP
Option : GPIB, TTL
6 sec. (Excluding tester communication time)
1/3,000
Loading
Pre-soak and Post-recovery
Rotator
Binning
The 3110-FT can be configured to suppor t
virtually any industry standard communication
interface and provide different docking options
for various testers. It is also capable of supporting
thermal test environments from -40˚C to 125˚C
which will insure the durability of the devices.
With a user-friendly graphic interface and quick
device change setup, changeover is short and
easy further increasing flexibility and productivity.
ORDERING INFORMATION
3110-FT : Full Range Active Thermal Control Handler
Quad-site FT Test Handler
SPECIFICATIONS
Model
Dimension
(W x D x H)
Weight
Facility
Applicable Device
Contact Mode
Interface
KEY FEATURES
■ 9K pcs throughput ( Model 3160 / 3160A )
■ Flexible array test and fingerprint pattern test
(Model 3160F)
■ 1~10 Kgf miniature contact force
(Model 3160F)
■ In line 1 x 4 flexible DUT configuration
(Model 3160 / 3160F )
■ In line 1 x 4 & matrix 2 x 2 flexible DUT
configuration (Model 3160A)
■ Motor arm Z (Model 3160A)
■ Side knock cylinder (Model 3160A)
■ Auto empty (option)
(Model 3160A / 3160F)
■ Programmable pitch probes
■ Side mount available
■ Programmable pneumatic air damper
control to reduce contact force impact
■ Intelligent shuttle IC leftover check
■ Yield monitor (individual contact head)
■ Universal change kits
■ ESD enhanced
The Chroma 3160/3160A/3160F handler is a
productive pick and place system for high volume
multi-site IC testing. Saving floor space, time
and cost, the 3160 Series handler can increase
production productivity and efficiency with its
innovative design. The system is configurable for
single, dual or quad test sites.
Multiple Site
(4 sites)
Contact Area
Index Time
(excluding tester
communication time)
Jam Rate
Applicable Tray
Category
Contact Force
(accuracy ±1 kgf )
Temperature
High Temperature
(option)
SOCKET CCD
(option)
Fingerprint pattern
generator
Model 3160/3160A/3160F
3160
3160A
3160F
1700 x 1300 x 2000 mm
1800 x 1380 x 2050 mm
Approx. 900 kg
Approx. 1,200 kg
Power :
AC 220, 50 / 60 Hz single phase, 10 KVA max.
Compressed air :
0.5 MPa or more (dry & clean air), Consumption 120 l/min., constant supply
Type :
Package carried on type :
BGA, QFP, CSP, QFN,
BGA, QFP, CSP, PLCC, TSOP, PGA, etc.
Flip chip, TSOP, etc.
Package size :
Package size :
3 mm x 3 mm to 50 mm x 50 mm
3 mm x 3 mm to
25 mm x 25 mm
Direct Contact / Drop and Press
Standard : TTL
Standard : TTL x 2 & GPIB x 1
Option : GPIB, RS232
Option : RS232, TCPIP
In line :
1 x 4, pitch X=
In line :
In line :
40/57.15/60 mm
Matrix :
1 x 4, pitch X = 40 mm
1 x 4, pitch X = 40 mm
2 x 2, pitch XY=
57.15 x 63.5/80x60 mm
Test head area :
550 mm
(from socket center)
Test head area : 600 mm (from socket center)
Socket mounting height : Socket mounting height : 1,100 mm (1,200 mm option)
1,000 mm
(1,100 mm option)
0.4 sec.
0.38 sec.
2.5 sec.
1/8,000
1/10,000
JEDEC
6 categories (3 auto, 3 manual)
1/8,000
50 kgf
1~10 kgf
80 kgf
Operating mode : ambient
Operating mode : 40℃~ 150℃ (heating time : within 30 min.)
Accuracy : contact head ± 3℃, pre-heater ± 5℃
CCD checks socket and
-prevents double stack of
-parts in the socket
Array testing
--Fingerprint pattern
testing
The Chroma 3160/3160A/3160F are also capable
of handling various package sizes and types
then bin them according to customers' specified
test results. The 3160 series system has a reliable
handling mechanism, is compatible with standard
conversion kits and has a streamlined automation
sequence, which results in high throughput with
low jam rate. Its precisely adjustable contact Loading
Test Site
force, fine alignment positioning and various
device sensors also reduces unexpected device
damage and helps extend test socket lifetime while ORDERING INFORMATION
maintaining or increasing production yields.
3160 : Quad-site FT Test Handler
3160A : Quad-site FT Test Handler
3160F : Fingerprint FT Test Handler
Unloading
Model 3160A
Tri-Temp Quad Sites Test Handler
SPECIFICATIONS
Model
Dimension (W x D x H)
Weight
Facility
Applicable Device
Contact Mode
Interface
Multiple Site
Contact Area
Index Time
KEY FEATURES
■ Advance thermal technology (Nitro TEC)
■ Faster index time 0.6 sec
■ Active thermal control and full range
temperature
■ Chamber less design
■ Support multiple sites
(Single, Dual or Quad test sites)
■ Simple, quick kit changeover
Nitro TEC Thermal Technology
Chroma releases new thermal solution "Nitro-TEC
thermal technology" which is a combination of
Nitrogen and TEC control system. Comparing to
traditional LN2 cooling system, Nitro-TEC thermal
technology brings the below advantages to user.
Rotation Function (option)
Jam Rate
Category
Contact Force
Thermal Range
Coolant
Changeover Time of Change Kit
Model 3160C
3160C
2,300 mm x 1,850 mm x 2,100 mm
Approx. 1,650 kg
Power : AC220, 50/60 Hz single-phase, 10 KVA max.
Dry air : -70℃ dew oint, 0.5 Mpa, 1,200 L/min.
LN2 source : 0.35Mpa (50 Psi), consumption 0.6 kg/min.
Type : BGA, QFP, CSP, QFN, Flip chip, TSOP, etc.
Package size : 3 mm x 3 mm to 50 mm x 50 mm (Ball pitch > 0.35mm)
Direct contact / drop and press
Standard : TTL & GPIB
Option : RS-232, TCP/IP
Dual sites : 1 x 2 (80 mm)
Qual sites : 1 x 4 (40 mm)
Qual sites : 2 x 2 (80 x 60 mm)
Test Head Area : 600 mm (from socket center)
Socket mounting height : 1,100 mm (1,200 mm option)
0.6 sec. (excluding tester communication time),
max. uph up to 3,200 at zero test time
± 90˚ , ± 180˚
1/5,000 for ambient / hot / cold temperature mode
7 categories (3 auto, 4 manual)
120 kgf
Temperature range : -40℃ to 125℃ before contact
Test head : set-point ± 3℃ before contact
Pre-soak buffer and input shuttle : set-point ± 5℃ before contact
Non-conductive, 3M Novec thermal fluid
15 mins
ORDERING INFORMATION
3160C : Tri-Temp Quad Sites Test Handler
- ATC control system with better temperature
accuracy during testing
- Allows customer switch Hot and Cold
temperature test quickly
- Soaking room with liquid nitrogen to pre-cool
device efficiently
- Shorten the down time, when maintaining
handler or exchanging kits
- Less LN2 consumption
Chroma 3160C Handler is productive pick & place
system for high volume multi-site IC testing. It
is capable of handling various package types of
device and supports Single, Dual or Quad test
sites. The reliable handling mechanism and
functionality outfit leads to high throughput
and low jam rate. Chroma 3160C can increase
production productivity and efficiency and
shorten the time of exchanging kits. The system
come with Active Thermal Control (ATC) System to
test the DUT -40℃to 125℃.
Auto tray load / unload
Pre-soak
Test head
Rotator
Defrost
Programmable probe
Octal-site FT Test Handler
Model 3180
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
KEY FEATURES
■Up to x8 Parallel Test Sites
■ Up to 9000 UPH
■ Flexible Test Site Configuration
■ Dampened Contact Force
■ Contact Force Auto Learning
■ 3x3 mm ~ 50x50 mm Packages
■ Temperature Test from Ambient ~ 150 ℃
■ Intelligent Auto Retest & Auto Retry
■ Yield Monitor
3180
1860 mm x 1380 mm x 2050 mm
Approx. 1300 kg
Power : AC220, 50/60 Hz Single-Phase, 10 KVA Max.
Facility
Compressed Air : 0.5 MPa or higher (dry and clean air)
Flow Rate : 120 L/min., constant supply
Type : BGA, QFP, CSP, QFN, Flip chip, TSOP, etc.
Applicable Device
Package Size : 3 mm x 3 mm to 50 mm x 50 mm *
Contact Mode
Direct contact / Drop and Press
Standard : TTL, GPIB
Interface
Option : RS232, TCPIP
Octal Sites (4x2)
Multiple Site
Matrix Quad Sites (2x2)
In-line Quad Sites (4x1)
Test Head Area : 600 mm (from socket center)
Contact Area
Docking Height : 1100 mm (1000/1200mm option)
Index Time
0.4 sec (excluding tester communication time)
Jam Rate
1/10,000
Category
6 categories (3 auto, 3 manual)
Contact Force
Up to 120 kgf
Mounting Type
Direct mount / Side Mount
Applicable Tray
JEDEC
Throughout (Max.)
Up to 9000 UPH (Illustrated by BGA 4x6, 20x37 tray matrix)
Operating Range : ~ 150℃ (Heating time < 30 min.)
High Temperature (Option)
Accuracy : Contact Head ± 3 ℃, Pre-heater ± 5 ℃
* Maximum package size may vary due to test site pitch
TEST SITE CONFIGURATION
The Chroma 3180 Handler is a productive pick
& place system for high volume multi-site IC
testing. Saving floor space, time and cost, the
3180 can increase production productivity and
efficiency with its innovative design. The system
is configurable for single, dual, quad or octal test
sites and can be upgraded to test the DUT up to
150 ℃.
Dual-site
The Chroma 3180 is also capable of handling
various package sizes and types then bins them
according to customer specified test results. The
system has a reliable handling mechanism, is
compatible with standard Conversion Kits and
has a streamlined automation sequence, which
results in high throughput with low jam rate. Its
precisely adjustable contact force, fine alignment
positioning and various device sensors also
reduces unexpected device damage and helps
extend test socket lifetime while maintaining or
increasing production yields.
Octal-site
Quad-site
80 mm
X
X
X
80 mm
Y
X = 40 / 57.15 / 60 mm
Y = 60 / 36 / 63.5 mm
40 mm 40 mm 40 mm
60mm
KIT CONFIGURATION
Quick Fit Kit (standard)
ORDERING INFORMATION
3180 : Octal-site FT Test Handler
RF Solution Integrated Handler
Model 3240-Q
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
3240-Q
1360 mm x 1390 mm x 1930 mm
900kg
Power : AC200V, Single phase 50/60Hz, 10 KVA Max.
Compressed Air : 0.5 MPa or higher (dray and clean air)
Flow Rate : 150 L/min, constant supply
Type : CSP, BGA, Gull Wing Package
Package Size : 3 mm x 3 mm to 40 mm x 40 mm
Package Height : 0.5 mm to 5 mm
Lead / Ball pitch : 0.5 mm / 0.4 mm and above
3 categories (1 auto, 2 manual)
JEDEC or EIAJ
4 sec.
Direct Contact / Drop and Press
Up to 50 ± 1 kgf
4 sites, 2x2, Pitch X = 120 mm, Y = 120mm
8 sites, 4x2, Pitch X = 100 mm, Y = 120mm
-63dB
-91.5dB
2.4GHz : -80dB @ Distance >250mm (=2*λ2.4GHz)
1/5,000
GPIB
Operating Range : Ambient ~ 125˚C (Heating Time < within 30 min.)
Accuracy : Contact Head ± 3˚C, Pre-heater ± 5˚C
Facility
Applicable Device
Category
Applicable Tray
Index Time
Contact Method
Contact Force
Test Site Configuration
KEY FEATURES
■ Cost-effective Integrated RF Solution
■ Customized RF Isolation Chamber with
Integrated Tester Docking
■ Up to 120 mm Test Site Pitch
■ Up to x8 Parallel Test Site
■ 3x3 mm ~ 45x45 mm Package
■ Precise Positioning
■ Compatible with JEDEC and EIAJ tray
The Chroma 3240-Q is a unique and innovative
handler with integration of RF/Wireless isolation
chamber. The system is configured for up to octalsite with individual isolation for true parallel test.
With a streamlined automation sequence, precise
Pick & Place system, flexible test site configuration,
high throughput and low jam rate, the 3240-Q is
ideal for RF/Wireless production test.
The Chroma 3240-Q is also capable of handling
various package sizes and types, accurately
binning according to customer specified test
results. With automatic Input/Output tray stacks,
the 3240-Q can accommodate both JEDEC and
EIAJ tray standards. Optional temperature control
extends the test capability to provide high
temperature testing up to 150℃.
PCB Same Site Isolation
PCB Different Site Isolation
Chamber Far Field Isolation
Jam Rate
Interface
Hot Temperature (Option)
TEST SITE CONFIGURATION
Quad-site
Octal-site
120mm
100mm
120mm
120mm
RF CHAMBER ILLUSTRATIONS
Bottom Cover
Top Cover
Loading
ORDERING INFORMATION
3240-Q : RF Solution Integrated Handler
Pre-alignment
Hybrid Single Site Test Handler
SPECIFICATIONS
Model
Dimensions (WxDxH)
Weight
Facility
Compressed Air
Applicable Device
Interface
KEY FEATURES
■ FT + SLT Handler – Two In One
■ Perfect for Device Engineering Characterization
Gathering and Analysis
■ Auto Tray Load/unload & Device Sorting
capability
■ Without socket damage issue
■ Air damper for good contact balance
■ Shuttle remain IC check function
■ Camera for real time system monitoring
■ Optional Tri-temp IC test function
(-55℃ ~ 150℃)
■ High power cooling function (option)
■ Diskless download function (option)
Chroma 3110 is a sigle site pick & place IC handler
which supports various types of package such
as QFP, QFN, TSOP, BGA, μBGA and CSP, etc.
The handler uses P & P technology to pick up
devices from JEDEC trays, move them to the test
site. The 3110 consists system level tests that are
designed to fully exercise programs as a whole
and check all integrated elements function
properly. It is capable to handle tri-temperature
test environment since ambient to thermal or low
temperature.
In addition to the capability of handling 3x3mm to
55x55mm devices, the machine is equipped with
1 auto stacks and 2 manual bin plates to maximize
the loading and unloading capacity. It features
a user-friendly graphic user interface based on
Windows system and also provides interfaces for
docking with various testers.
Jam Rate
Categories
Contact Force
Temperature
Tri Temp Control (Option)
ATC Module (Option)
Unity PTC (Option)
Cooling Pipe (Option)
Advantage
Option
Model 3110
3110
900 mm x 1250 mm x 1800 mm (Signal Tower excluded)
75 0 kg
Power : AC 220V, 50/60 Hz Single-phase
Maximum Power Consumption : 3.0KVA Max
Controller Circuit: 1.0 KVA Max.
Heater Circuit : 2.0 KVA (Option)
Dry Air of 5.0 kg/cm2 ( 0.49 Mpa ) or higher, constant supply
Type : BGA series, μBGA, QFP series, QFN, Flip-Chip, TSOP
Package Size : 3 mm x 3 mm to 55 mm x 55 mm
Depth : 0.5 mm to 5 mm
Lead / Ball pitch : 0.4 mm / 0.5 mm and above
Standard : RS-232,TCP/IP
Option : GPIB and TTL
1/3000
4 Categories (128 bin signals for RS232)
80 kgf (Accuracy ±1kgf ), 125Kgf (Option)
Operating Mode : Ambient
Temperature Range : -40℃ ~ 135℃ ± 2℃ (-55℃ ~150 ℃ Option)
Temperature Range : Ambient ~ 135℃± 2℃ (150℃ Option)
Temperature Range : ~ 85 ℃ (up to 300W Heat Dissipation)
Temperature Range : ~ 85 ℃ (up to 125W Heat Dissipation)
ECD function (Easy-edit communication define)
Single Movement Retest
Contact pick and place system
Yield control (Average yield of socket)
Continue Fail
Remote Control
Rotation (±90 degree)
Auto Load / Unload : 1 input / 2 unload (with 2 manual unload)
Fixed Load / Unload : 1 input / 4 unload
Final Test Configuration
3110 with tester
3110 with tri-temp chamber & tester
System Level Test Configuration
ORDERING INFORMATION
3110 : Hybrid Single Site Test Handler
3100-TT : Tri-temp Control (option)
3100-A : Active Thermal Control Module (option)
3100-P : Unity Passive Thermal Control (option)
3100-C : Cooling Pipe (option)
Chroma
Thermal
Control
Solutions
Active
Thermal
Control
Solution
Passive
Cooling
System
3110 with tri-temp chamber
3110 with module board
Configurations
Products
Capability
3100- TT
-55℃ ~ 150 ℃ ± 2℃
3100-A
Ambient ~ 135 ℃ ± 2℃
3100-P
3100-C
~ 85℃
(< 300W Heat Dissipation)
~ 85℃
(<125W Heat Dissipation)
Heat Exchanger+TEC (Peltier)
Yes
Water Chiller Cooling+TEC (peltier)
No
Closed-loop Liquid Cooling+TEC (peltier) No
Standalone
Water
Chiller
Yes
Yes
No
Closed-loop Liquid Cooling
No
No
No
No
No
Cooling Pipe
No
No
No
No
No
Test Plug Design
Dry Air
Chamber
TEC
Controller
External
Piping
Yes
No
No
Yes
Yes
Yes
Yes
Yes
No
Tabletop Single Site Test Handler
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
Facility
Device Type
KEY FEATURES
■ 600 mm (W) x 565 mm (D) x 800 mm (H)
■ JEDEC trays (2)
■ IC packages: 5x5 mm to 45x45 mm
■ Software configurable binning
■ Air damper contact
■ Optimizes IC force balance
■ Maximize test socket lifetime
■ Double stack protection
■ Continuous automated re-test
Test Site
Jam Rate
Tray Classification
Tray
Binning
Rotator
Contact Force
Contact Mode
Tester Interface
Socket CCD (Option)
Model 3111
3111
600 mm x 565mm x 800 mm (Signal Tower excluded)
Net Weight 80 kg
Power : AC 220V-240V, 50Hz/60Hz, single-phase,2.3kva
Dry Air of 5.0 kg/cm² (0.49 MPa) or higher, constant supply
Type: BGA series, _BGA, QFP series, QFN, Flip-Chip, TSO
Package size : 5 mm x 5 mm to 45 mm x 45 mm
Thickness : 0.5 mm to 5 mm
Lead / Ball pitch : 0.4 mm / 0.5 mm and above
Single site
1/3000
1 Category
JEDEC
128 software bins
±90 degree
10 kgf - 50 kgf (±1kgf )
Direct Contact / Drop and Press
Standard : RS-232, TCP/IP
Option : GPIB
CCD checks socket to prevent double stack of parts in the socket
Note 1 : 3111 alarm mail function is available by e-mail server setting
The Chroma 3111 Tabletop Single Site Test
Handler is an automated Pick & Place system
ideal for engineering and test development of
IC System Level Testing (SLT). The 3111 system is
capable of handling a vast variety of device types
and sizes ranging from 5x5mm to 45x45mm.
To maximize productivity, the 3111 offers a
remote func tion allowing handler control
from any distant location through an internet
c o n n e c t i o n. E q u i p p e d w i t h t wo s o f t w a re
allocatable JEDEC trays, the 3111 maximizes
the engineering test capability saving cost
and time, all within a 60 cm 2 table space. A
user-friendly graphic inter face (Windows™)
system provides a quick and easy device setup,
change or changeover simplifying the process and
increasing efficiency.
Test Site
Shuttle
Pin1 CCD
Category
ORDERING INFORMATION
3111 : Tabletop Single Site Test Handler
Automatic System Function Tester
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
Facility
Compressed Air
Vacuum Source
Applicable Device
KEY FEATURES
■ Reliable high-speed pick & place handler
■ Auto contact-force learning
■ Gull wing package capability
■ No socket damage
■ Air damper for contact balance
■ IC-in-socket protection
■ NS-5000/6000 change kits compatible
Chroma 3240 is an innovative handler for high
volume/multi-site IC testing at system level. It is
capable of handling packages of various types
including QFP, TQFP, BGA, PGA, etc. The handler
uses pick and place technology to pick up devices
from JEDEC trays, move them to the test site,
then move them to the appropriate bin after test.
It features a 90-degree device rotation which is
required for various pin one orientations.
Multiple Testing Layout
Index Time
Jam Rate
Applicable Tray
Categories
Contact Area
Contact Force
High Temperature
(Option)
Tester Interface
Chroma 3240 can test up to 4 devices in parallel
at high temperature with ATC (Auto Temperature
Cooling) ranging from 50˚C to 125˚C.
Special Function
Model 3240
3240
1640 mm x 1190 mm x 1774 mm (Excluding Signal Tower)
Net Weight 800kg
Power : AC 220V , 50/60 Hz Single-phase
Maximum Power Consumption : 3.0 KVA Max
Controller Circuit : 3.0 KVA Max.
Heater Circuit : 1.0 KVAMax.
Dry Air of 5.0 kg/cm2 ( 0.49 Mpa ) or higher constant supply
Built-Diaphragm Vacuum Pump : Pumping Volume 100 L/min
Ultimate Pressure : 100 Torr Max.
Package Type :
BGA series , µGA, PGA, QFP series, CSP, BCC, QFN , Flip-Chip , TSOP
Package size : 7 mm x 7 mm to 40 mm x 40 mm
Depth : 0.9mm to 5mm
Lead / Ball pitch : 0.4mm / 0.5mm and above
Weight : 0.2g to 20g
4 sites (Pitch 400 mm)
2.1 sec (Excluding test communication time) / One site cycle time : 3.2 Sec.
1/3000 pcs
Type :
Input / Empty Tray : 130 mm ~ 143 mm (D) by 310 mm ~ 330 mm (W)
Output Tray : 135 mm ~ 150 mm (D) by 290 mm ~ 330 mm (W)
Capacity :
Input / Empty Tray : Elevator with 210 mm stroke (JEDEC)
Output Tray 1, 2, 3 : Elevator with 210 mm stroke (JEDEC)
3 Categories (Max. 128 bin signals with RS-232)
Test Site Pitch : 400mm
Test Module Dimensions : 400 mm x 400 mm
Max. 50 kgf ( Accuracy ±1kgf )
Operating Mode : Room Temperature / High Temperature
Temperature Range : ~125˚C (Heat-up time : Within 30 min)
Accuracy : Pre-heater Buffer ±5˚C , Contact Area ± 3˚C
Standard : TTL
Option : RS-232, GPIB
Tray map fit for producion analysis
Universal kit design
Change over time within 15 min.
ECD function (Easy -edit Communication Define) for various equipment
Two Tray (Color tray) mode available
Continue Fail Alarm
Auto Z function
Yield Control (Average yield of socket)
Yield Monitor (Per contact head plug)
ATC (Auto Temperature Cooling) High Temperature Function
ORDERING INFORMATION
3240 : Automatic System Function Tester
Automatic System Function Tester
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
KEY FEATURES
■ Reliable high-speed pick & place handler
■ Auto contact-force learning
■ Gull wing package capability
■ No socket damage
■ Air damper for contact balance
■ IC-in-socket protection
■ Invention patent 190373, 190377, 1227324 &
125307
■ Thermal Control Configurations
- Tri Temp Control
- Close-Loop Active Thermal Control
(ATC) Module
- Unity PTC (Passive Thermal Control)
Chroma 3260 is an innovative handler for high
volume/multi-site IC testing at system level. It is
capable of handling packages for various types
including QFP, TQFP, BGA, PGA, etc. The handler
uses pick and place technology to pick up devices
from JEDEC trays, move them to the test site, then
move them to the appropriate bin after test.
Chroma 3260 can test up to 6 devices in parallel
at high temperature with ATC (Auto Temperature
Cooling) ranging from -40˚C to 125˚C.
Model 3260
3260
2570 mm x 1360 mm x 1780 mm
1300 kg
Power : AC 220, 50/60 Hz Single-Phase
Maximum Power Consumption : 6.0 KVA Max
Facility
Controller Circuit : 3.0 KVA Max
Heater Circuit : 3.0 KVA (Option)
Compressed Air
Dry Air of 5.0 kg/cm2 (0.49 Mpa) or higher, constant supply
Build-in Diaphragm Vacuum Pump: Pumping Volume : 100 L/min
Vacuum Source
Ultimate Pressure : 100 Torr (-13.3 Kpa) Max.
Type : BGA series, μBGA, Pga, QFP series, CSP, BCC, QFN, Flip-Chip, TSOP
Applicable Device
Outer dimensions: 4 mm x 4 mm to 45 mm x 45 mm
Lead / Ball pitch : 0.4 mm / 0.5 mm and above
Multiple Testing Layout 6 sites (Pitch 400 mm)
Index Time
3.0 sec (excluding test communication time)/ One site cycle time : 3.5 Sec
Ram Rate
1/5000 pcs
Applicable Tray
JEDEC and EIAJ
Categories
4 categories (6 categories for option)
Contact Force
Max. 60 Kgf (accuracy ± 1kgf ) by servo motor (80 Kgf for Option)
Operating Mode : Room Temperature / High Temperature
Soak Hot Temperature Temperature Range : 50℃ to 150℃ (Heat-up time: Within 30 min)
(Option)
Accuracy : Pre-heater Buffer ± 5℃, Contact Area ± 3℃
Cooling Head : 10℃ + 5℃
Operating Mode : Room Temperature / Cold Temperature
Temperature Range : room temperature ~ -55℃
Accuracy : Contact Area ± 3℃
Tri Temp Control Temperature Range : -40℃ ~ 125℃ ± 2℃ (150℃ Option)
Temperature
(Option)
or -55℃ ~ 135℃ ± 2℃ (150℃ Option)
Control
(Option)
ATC Module
Temperature Range : Ambient ~ 135℃± 2℃
(Option)
(150℃ Option)
Unity PTC
Temperature Range : ~ 85 ℃
(Option)
(up to 300W Heat Dissipation)
Standard : RS-232
Tester Interface
Option : GPIB, USB and TTL
Universal kit design
ECD function (Easy-edit communication define)
Two tray (Color tray) mode available
Continuous fail retest function
Real pick and place system
Features
Yield control (Average yield of socket)
Yield monitor (Per contact head plug)
System Invention Patent No.: 190373
Process Invention Patent No.: 190377
CCD camera for device orientation detection
Socket sensor / Socket CCD
RF Shielding Box : 55db for PCIe, 80~90db for PCI/USB/RS232
Rotator (90 degree)
Option
Fault Auto Correlation Test (FACT)
Built in Continuity Test (BICT)
PoP handling capacity
ORDERING INFORMATION
3260 : Automatic System Function Tester
Die Test Handler
Model 3112
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
Facility
KEY FEATURES
■ Reliable Pick&Place bare die test handler
■ Multi-plate input and automated test sorting
capability
■ Omni-directional adjustable probe stage
(X/Y/Z/θ)
■ Stage remain die check function
■ x12 output tray and programmable output
binning
■ Real time yield control monitor (Per Dut)
■ Real time probing status monitoring
Chroma 3112 is a productive pick and place
handler for high volume single or multi-site bare
die testing. It is capable to handle various of bare
die. The handler 3112 uses P&P technology to
pick up bare die from chip tray, move them to the
test stage and bin them upon sorting result. High
throughput with low jam rate is the consequence
result from the reliable handling mechanism and
functionality outfit. The remain die check function
reduce unexpected damages occurred.
Application Die Size
Test Site Number
Input Loader
Number of sorting
catagories
Probe Card Outside
Dimension
Carrier Tray Outside
Dimension
Contact Force
Probe Alignment
(X / Y / Z / θ)
Interface
UPH
Jam Rate
Change Over Time
3112
1020 mm x 870mm x 1300 mm
Net Weight < 250 kg
Power : Single-phase, AC 220V, 60 Hz / 2.4KVA
Compressed Air : Dry Air of 5.0 kg/cm2 ( 0.5 Mpa ) or higher, constant supply
5 x 5 mm to 15 x 15 mm
Single site ; Dual site
4 manual tray
12 manual output tray (128 bin software bins)
4470 x 5620 mil (113.5 x 142.7 mm)
* Probe card provide by customer
Standard size : 101.4 x 101.4 mm
Max. 10 kgf
Manual alignment by probing stage
Standard : RS 232
Optional : GPIB
> 360 (Test Time : 7 sec.)
Cycle Time : 4.5 sec.
Index Time : 5 sec.
1/2000 (exclude any sticky residue)
< 10 min.
Loading
Picking Up
Positioning
Testing
The automation of testing and sorting techniques
that applied to the bare die testing, not only in the
production efficiently, reducing human resources
and ensuring the test quality, but also reducing
the testing defect rate.
ORDERING INFORMATION
3112 : Die Test Handler
3112 tabletop handler
Miniature IC Handler
Model 3270
SPECIFICATIONS
Model
Dimension (WxDxH)
Weight
Facility
Applicable Device
Multiple Test Sites
Index Time
Cycle Time
Jam Rate
Applicable Tray
KEY FEATURES
■ High throughput for CIS Testing
■ Reliable high-speed pick & place handler
■ 3x3 mm miniature device handling capability
■ Air damper for contact balance
■ Socket damage free
Categories
Contact Force
High Temperature
(Optional)
Tester Interface
3270
2100 mm x 1540 mm x 1720 mm
Net Weight 1300 kg
Power : AC220V ± 10%, 50/60 Hz 3-Phase
Maximum power consumption : 12KVA, 20A
Compressed Air : Dry air of 5.0 kg/cm2 (0.49 Mpa) or higher, constant supply
Type : BGA series, µBGA, PGA, QFP series, CSP, WCSP, PLCC, QFN, TSOP
Outer dimensions : 3 mm x 3 mm to 14 mm x 14 mm
Lead / Ball pitch : 0.4 mm / 0.5 mm above
16 sites
5 sec (Exclude power and communication time)
One site cycle time 6 sec (4 site simultaneously, tray pitch fixed)
1/2000 pcs
Standard tray size : JEDEC 135.9 mm(W) x 315 mm(L)
Tray thickness : 7.62 mm
5 Categories, 1 Auto, 4 Fixed (accepts 128 bin signals for RS-232)
Max. 50 kgf (Accuracy force ±1kgf )
Operating mode : room temperature / high temperature
Temperature setting range : Ambient to 50˚C
Standard : RS-232
Chroma 3270 is an innovative handler for high
volume/multisite miniature IC testing, especially
for CIS Testing (CMOS Image Sensor), at system
level. It is capable of handling devices of a large ORDERING INFORMATION
variety of package types including QFP, TQFP, 3270 : Miniature IC Handler
BGA, PGA, etc. The handler uses pick and place
technology to pick up devices from JEDEC trays,
move them to the test site, then move them to the
appropriate bin after test.
Chroma 3270 can handle 16 devices for parallel
test at ambient temperature to high temperature
50˚C
Test-In-Tray Handler
Model 3280
Chroma 3280 provides a high throughput
solution to SD cards manufacturers
Test-In-Tray provides the most efficient method
to move DUTs from input site to test site without
the use of a pick-and-place arm. The average
index time from input stack to test hive about 10
seconds for 120pcs micro SD cards.
High Parallel Test A Test Hive is integrated into
Chroma 3280 which provides the capability to test
120pcs micro SD cards simultaneously. Typically,
it takes 70 seconds test time for 120pcs 1GB micro
SD card.
KEY FEATURES
■ Tester & Handler Integration
■ Test 120pcs micro SD in parallel
■ Test-in-Tray, no pick & place arm before
sorting
■ UPH = 5400 with 70 sec test time
■ SD Protocol Aware Tester
■ DC Measurements
■ 32MB Buffer Memory per site
■ Microsoft Windows XP OS
■ Software provides tray map and binning
information
■ Compact Size: 164cm X 79cm X 180cm
■ Options:
- 3rd party test tools
- Change Kits for mini SD, SD and MMC
- Loading Content
The Chroma 3280 is an innovative integration
system for testing and handling SD cards in
parallel without picking any part before sorting.
SD Protocol Aware and Focused DC tests in the
3280 brings a revolutionary test methodology
to all SD cards (include MMC). The benefit to
customers is lower manufacturing cost from the
high throughput of the 3280. The compact size of
3280 also saves floor space in the manufacturing
facility.
The cost sensitivity involved with consumer
p ro duc ts cha lle ng e s tra di tio n a l fin al te st
methodology. To reduce the cost to consumers,
manufacturers must recognize the fact that SD
cards are built upon Known Good Die (KGD).
This recognition will narrow the tester's focus to
assembly related defects rather than retesting
KGD. A new focused tester that tests for assembly
will be smaller and less expensive than traditional
solutions. That smaller size then allows for more
parts to be tested in parallel in a reduced area,
further reducing the unit of test cost. Additionally,
the high yield of SD cards using KGD leads to
a small footprint Test-in-Tray mechanism. This
integrated combination of tester and handler with
a reduced footprint facilitates low cost solution of
the Chroma 3280.
Pick Up Reject SD card Only By using the
Test-In-Tray and high yield SD cards, the Chroma
3280 only picks up defective devices from the
sorting tray to the reject tray and replaces the
good devices from the buffer tray to the sorting
tray. Assuming a 98% yield rate only need to
be removed 2~3 devices from the sorting tray.
Therefore, the average sorting time is less than the
average testing time. That also enables the testing
and sorting to be concurrent, so sorting will be
completed before testing.
Test Coverage
SD Protocol Aware Tests
■ Check CID Reg
■ Check CSD Reg
■ Check OCR Reg
■ Check SCR Reg
■ Check SD Status
■ Functional Test
DC Measurements
■ Open/Shorts
■ ESD Diodes
■ Power Up Idd
■ Leakage
Software Functions
■ Password control system for user privileges
management
■ Provide safety detecting alarm system
■ Auto alarm for binning time-out error
■ Visual display for error jam area
■ Provide off-line mode for dummy running
■ Real-time testing result display
■ Individual DUT enable and disable control
■ Yield display for each output tray
■ Real-time UPH display
■ Multiple yield stop monitor functions
■ Loading device counter control
■ Door-opened interrupt protecting function
■ Emergency stop control
■ Keep alarm log for over 30 days
Test-in-Tray
Firecracker II
The design circuit of the Firecracker II is identical
to a single test circuit (Fire Channel) in the test
hive of the Chroma 3280. The Firecracker II
provides a very convenient tool for generating a
test program off line. Users can plug in micro SD,
mini SD, SD and MMC devices on the left side of
the cartridge. USB connector is located at the right
side of the Firecracker II which can be connected
with a USB cable to communicate with a portable
device such as a notebook computer.
Sorting Status
Test-In-Tray Handler
SPECIFICATIONS
Model
System
Basic Specification
Tester
Change Kit
Facility
Applicable Package
Applicable Tray
Dimensions and
Weight Limit
Index Time and
Throughput
Pick & Place Arm
Device
Contact method
Test Interface
Loader and
Un-loader Capacity
System Jam Rate
Kit conversion time
ORDERING INFORMATION
3280 : Test-In-Tray Handler
Model 3280
3280
Test-In-Tray Handler
Temperature Control Range : Ambient
Tray Input: 1 Auto Stack. Output Tray : 1 Auto Stack
Test hive interfaced with Tester
Tester integrated into Handler
One Pick & Place arm, one buffer tray and one reject tray
Chroma TnT Production Test Tool
Skymedi Production Test Tool
By Customer Request: Phison, Silicon Motion & InCOMM
One micro SD change kit per handler
SD, Mini SD and MMC (optional)
Power : 220VAC ± 10%, 50/60 Hz, single phase, less than 4KW
Compressed Air : 0.5MPa
micro SD
mini SD, SD and MMC (Optional)
Standard tray size: JEDEC 135.9mm(W)x 315mm(L)
Applicable tray thickness: 7.62mm
1640 mm (W) x 790 mm(D) x 1800 mm(H); WEIGHT: 650KG
Max. UPH = 42,000, when test time is 0
UPH = 5400, when test time is 70 sec with DUTs better than 97% yield
X Arm Max. Speed: 2.9 M.P.S.
Y Arm Max. Speed: 3.75 M.P.S.
Regular Sorting Speed: 6 sec per failed DUT
Sorting concurrently occurs with testing
960 Pogo Pins each insertion
7.1 Newton per DUT
8 Pogo pins per DUT
Current Motor Max. Force: 320KG F
Standard : RS-232, USB
Option : Ethernet
Input Tray Stacker : 1 Automatic with 30 JEDEC Trays
Output Tray Stacker : 1 Automatic with 30 JEDEC Trays
Less than 1/5000 devices
Less than 5 min. for SD products
Change Kit Setting File is saved in handler. Any necessary software and hardware adjust within 1 minute
PXI Test & Measurement Solution
General-purpose Chassis & Backplane
High Precision Source Measure Unit
Device Power Supply
Programmable DC Power Supply
Extension Card
15-1
15-2
15-5
15-6
15-7
Overview
General Purpose Chassis
PXI Backplane
High Precision
Source Measure Unit
Device Power Supply
Programmable DC Power Supply
Extension Card
PXI General Purpose Chassis & Backplanes Model 52100 Series
Systems Alliance
Power Supplies
Th e PX I-52100 c h a s s i s a cce p t s re m ova b l e
power supply modules of the cPWR series. The
power connector is a PCI 47M 400A1 connector,
compliant with PICMG 2.11 Power Inter face
Specification standard, a mechanically and
electrically roBust connector.
8/14/18-Slot
KEY FEATURES- CHASSIS
■ High-capacity 8-slot/14-slot/18-slot PXI/cPCI
backplane
■ Low-profile 4U rugged design
■ Easily convertible for rack or bench used
■ 51 CFM for 3/4/6 high pressure tube-axial fans
■ 175W/ea plug-in power supply
■ Removable fans and air filter
■ Optional DC ( 24V ) input configuration
available
■ Comprehensive EMC shielding
KEY FEATURES- BACKPLANES
■ Compliant With PXI Specification R2.0
■ Accepts Both PXI and CompactPCI
(PICMG 2.0 R3.0) 3U Modules
■ Standard 3U Form Factor
■ Two ATX Sockets and Screw Terminals for
+3.3V, +5V, +12V & -12V DC Output Connection
■ 64-Bit PCI BUS On P1 & P2, Supports N-1
BUS- Mastering I/O Slots. (N : Slots)
■ System Controller Slot Is Located In Slot 1
■ Trigger Controller Slot Is Located In Slot 2,
Providing Individual Triggers To All Other
Peripherals
■ Dimension :
- 8-slot / 227.3mm x 128.7 mm x 3.2 mm
- 14-slot / 337.5mm x 128.7mm x 3.2mm
- 18-slot / 420.6mm x 128.7mm x 3.2mm
Chassis
The PXI-52100 platform features the industrystandard, 8-slot/14-slot/18-slot PXI/ CompactPCI
backplane integrated into a 3U Eurorack enclosure
with a bay for removable power supplies.
With hot pluggable power supplies and optional
battery packs, 52100 offers the widest application
range of all chassis on the market.
M ounting attachment locations allow the
PXI-52100 to be mounted against a wall or
bulkhead, with the card cage extended in front for
easy access to adapter card. The rear of the card
cage is enclosed to protect the backplane from
contamination as well as provide shielding for RFI/
EMI.
52101-A : 8-slot backplane
15-1
Backplanes
PXI (PCI eXtensions for Instrumentation) defines
a rugged PC platform for measurement and
instrumentation. PXI products are compatible
with the Compac tPCI industrial computer
SPECIFICATIONS
Chassis
standard but offer additional features, such
as environmental specifications, sof t ware
requirements, and built-in timing and triggering.
Moreover, PXI backplane provides configuration
control and longer product lifetimes than typical
desktop design.
PXI backplane is designed for instrumentation
computer. Its architecture makes rapid repair by
board substitution possible and system upgrades
and changes are greatly simplified, with minimum
resulting system downtime.
52101
52102
52105
• 3U-sized; PXI backplane
• Compliant with PXI Specification R2.0
Backplane
• PXI and CompactPCI (PICMG 2.0 R3.0) 3U modules
8 slots
14 slots
18 slots
Accessible Slots
Output:
Output: 175W max. x 2 sets
175W max. x 4 sets
Power Supply
• AC Input: 90V to 264V
• DC Input: 18V to 36V
64-bit
BUS Width
4U, 19" EIA format
Rack Mounting
Slot cooling capacity in worst-case slot is 50W
Cooling Capacity
Forced air circulation
Forced air circulation
Forced air circulation
( positive pressurization) ( positive pressurization) ( positive pressurization)
Module Cooling
via 51 cfm (x3)
via 51 cfm (x4)
via 51 cfm (x6)
P1 to P2, bottom of module to top of module
Slot Airflow Direction
75,000+hr
Module Cooling Fan MTBF
8.5kg
9.5kg
13.5kg
Weight
• Desktop:
• Desktop: 442.2 x 257.8 x 192.1
442.2 x 481.2 x 192.1
Dimensions (WxDxH) mm
• Rack-mount:
• Rack-mount: 482.6 x 257.8 x 177.0
482.6 x 481.2 x 177.0
0˚C ~ 55˚C
Operating Temp.
-20˚C ~ 70˚C
Storage Temp.
10 ~ 95% @ 40˚C, non-condensing
Humidity
5 ~ 100Hz: 0.015G2/Hz; 100 ~ 200Hz: -6 dB/Oct; 200 Hz: 0.0038 G2/Hz
Packaged Vibration
5 ~ 55 ~ 5Hz 0.38mm Peak to Peak
Unpackaged Vibration
Falling Height: 76 cm; Falling: 1 corner/3 edges/6 faces
Drop Test
Acceleration: 10G; Pulse width: 11ms; Pulse shape: half sine wave;
Shock Test (Operating)
No. of shock: 3 shocks for bottom side
ORDERING INFORMATION
52101-1/52102-1
52105-1
52101-A
52102-A
52105-A
Chassis (w/Backplane)
1
1
8-Slot, 3U 64-Bit PXI Backplane
14-Slot, 3U 64-Bit PXI Backplane
18-Slot, 3U 64-Bit PXI Backplane
52102-A : 14-slot backplane
AC Power Supply (Input 110/220Vac)
2
4
52105-A : 18-slot backplane
All specifications are subject to change without notice.
High Precision Source Measure Unit
Model 52400e/52400 Series
Video &
Color
Systems Alliance
5W Load
5W Source
Electrical
Safety
200 mA
-25V
25V
V
-200 mA
Semiconductor/
IC
5W Source
5W Load
52401e-25-200m/52401-25-200m
I
3.5A
2.5A
PXI Test &
Measurement
25W Source
1A
5V
-25V
25W Source
-10V
25V
10V
-5V
-1A
-2.5A
V
10W Load
52405e-25-3/52405-25-3
52405e-10-2/52405-10-2
52405e-25-1/52405-25-1
52405e-5-3/52405-5-3
Control Bandwidth Selection
To r e d u c e t e s t t i m e s, C h r o m a's S M Us a r e
designed for fast response providing high speed
output voltage and current. The impedance
of the DUT, fixture, or cabling may cause loop
instabilit y under voltage or current source
mode. An unstable loop can cause saturation,
oscillation, or even damage the DUT.
52400e/52400 Series
15-2
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
-3.5A
All specifications are subject to change without notice.
Power
Battery Test &
Passive
Electronics Automation Component
Unique Hardware Sequencer
The Chroma Hardware Sequencer is a powerful
tool that can predefine commands as instrument
executable steps. This allows latency free control
and measurement since no PC interaction is
required during execution. Once the instrument
receives the start trigger, it will execute step
commands in the sequencer table line by line or
as defined by the trigger. Shown below are the
soft panels for the SMU in hardware sequencer
mode (left) and direct operation mode (right).
I
10W Load
The SMU combines four-quadrant operation
with precision and high speed measurement.
This makes the SMU an ideal instrument in many
parametric test applications ranging from ICs,
two-leaded components such as sensors, LEDs,
laser diodes, transistors, to solar cells, batteries
and many other electronic devices.
Automated
Optical Inspection
The Chroma 52400e is a series of 3U PXI Express
module that can host 2 programmable source/
measure channels, while 52400 is a series of 3U
PXI module hosting 2 programmable source/
measure channels. They are designed for highly
accurate source or load simulation with precision
voltage with precision voltage and current
measurement.
Four Quadrant Operation
All 52400e/52400 series SMUs suppor t four
quadrant operation for applications that require
a reverse voltage/current source or load. During
a load operation, the module is limited by the PXI
chassis' standard of 20W heat dissipation per slot.
Shown below are the quadrant diagrams with the
operating regions of the Chroma PXIe/PXI SMUs.
Photovoltaic Test
& Automation
APPLICATIONS
■ Semiconductor Test
■ LED / Laser Diode Test
■ Battery Test
■ Transistor Test
■ Solar Cell Test
■ Electric Vehicle Test
■ Avionics Test
■ Power Electronics Test
■ Sensor Test
T h e 524 0 0 e /524 0 0 s e r i e s h a v e p a t e n t e d
hardware sequence engine that uses
deterministic timing to control each SMU.
The sequencer's on-board memory can store
up to 65535 sequencer commands and 32k
measurement samples per channel, allowing
cross module/card synchronization and latency
free output control and measurement. No PC
communication is required during execution
of the hardware sequencer test process.C, C#,
LabView, LabWindows APIs and versatile soft
front panels come standard with each SMU. The
back connectors are compatible with both PXIe
and hybrid chassis. All of these features enable
easy integration to PXIe or PXI-hybrid systems
designed for a wide range of applications.
Optical
Devices
KEY FEATURES & FUNCTIONS
■ PXI Express Peripheral Module
(X1 PCI Express Link) (Model 52400e Series)
■ Four quadrant operation
■ 18-bit source/measure resolution
(multiple selectable ranges)
■ Low output noise
■ High measurement speed (100k s/S)
■ High output slew rate
■ Optional measurement log
■ DIO/Trigger bits
■ Output profiling by hardware sequencer
■ Programmable output resistance
■ Floating & Guarding output
■ 16 Control Bandwidth Selection
■ Master / Slave operation
■ Driver with LabView/LabWindows & C/C# API
■ Softpanel GUI
To prevent system instability, the 52400e/52400
series SMUs provide 16 user selectable control
bandwidths, eliminating the need for external
capacitors or inductors placed near the DUT. This
results in faster output rise time, reduced voltage
ripple and noise, and reduced transient response.
The control bandwidth can be modif ied via
software to maximize test flexibility and minimize
downtime when changing DUTs.
Flat Panel
LED/
Display Lighting
52400e Series
The 52400e/52400 series feature: 16 selectable
control bandwidths to ensure high speed output
and stable operation; multiple source/measure
ranges with an 18-bit DAC/ADC to provide the
best resolution and accuracy available with a
sampling rate up to 100K s/S; programmable
internal series resistance for battery simulation;
±force, ±sense and ±guards lines to avoid
leakage current and reduce settling time -especially useful for low current test applications.
High Precision Source Measure Unit
Versatile Soft Front Panel
Guarding for Low Current Application
Guarding is an important technique for very-low
current measurements. Guarding reduces leakage
current error and decreases settling time. This is
achieved by keeping the potential of the guard
connector at the same potential as the force
conductor, so current does not flow between
the force and guard conductors. Guarding also
eliminates the cable capacitance between the
SMU and DUT.
Model 52400e/52400 Series
Master/Slave Operation
For ma ximum f le xibilit y, the 52400e/52400
series SMUs support Master/Slave operation
when higher current under FVMI (Force Voltage
Measure Current) mode is required. To ensure
accurate current sharing between modules and
maximum performance, Master/Slave operation
is only allowed between SMUs of the same model
number.
Current sharing is achieved by one channel
operating as the Master under FVMI mode while
the Slaves operate in FIMV mode. The Master
channel is programmed in voltage mode while
the Slaves are set to current mode. The Slaves
will follow the Master's set voltage. The wiring
diagram for current sharing in master/slave
control is shown to the right.
The Chroma 52400e series features two ±guard
wires per channel, resulting in faster and more
accurate measurements.
SPECIFICATIONS
Model Name
52401e-6-1
52401-6-1
Slots
Output Channels
4
Source
3W x 4
Load
1.8W x 4
Input Voltage
Backplane Power
Input Current
2.5A Max
Isolated but share
Output Isolation
common LO
Bit Resolution
16 Bits
Programmable
8 steps
Loop Bandwidth
Settling Time
52401e-25-200m
52401-25-200m
52405e-5-3 *1
52405-5-3 *1
52405e-10-2 *1
52405-10-2 *1
52405e-25-1 *1
52405-25-1 *1
0.7A Max
1
2
25W x 2
10W x 2
External 48VDC source required *2
2.2A Max
Isolated
Isolated by External Power Supply
5W x 2
5W x 2
52405e-25-3 *1
52405-25-3 *1
18 bits
16 steps
<30µSec, typically
±25V, ±12.5V, ±10V,
±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±10V, ±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±25V, ±12.5V, ±10V,
±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±3.5A(≤5V),
±2.5A(≤10V), ±1A,
±100mA, ±10mA,
±1mA, ±100uA,
±10uA, ±1uA
Force Voltage
anges
±6V
±25V, ±10V, ±5V,
±2.5V, ±1V, ±500mV
Force Current
Ranges
±1A, ±100mA,
±10mA, ±1mA,
±100uA, ±10uA
±200mA, ±20mA,
±2mA, ±200uA,
±20uA, ±2uA,
±200nA
±3.5A, ±2.5A, ±1A,
±100mA, ±10mA,
±1mA, ±100uA,
±10uA, ±1uA
±2.5A, ±1A, ±100mA,
±1A, ±100mA, ±10mA,
±10mA, ±1mA,
±1mA, ±100uA,
±100uA, ±10uA,
±10uA, ±1uA
±1uA
±6V
±25V, ±10V, ±5V,
±2.5V, ±1V, ±500mV,
±250mV, ±100mV,
±50mV, ±25mV,
±10mV, ±4mV
±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±10V, ±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±25V, ±12.5V, ±10V,
±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±25V, ±12.5V, ±10V,
±5V, ±2V, ±1V,
±500mV, ±200mV,
±100mV
±200mA, ±20mA,
±2mA, ±200uA,
±20uA, ±2uA,
±200nA
±3.5A, ±2.5A, ±1A,
±100mA, ±10mA,
±1mA, ±100uA,
±10uA, ±1uA
±2.5A, ±1A, ±100mA,
±10mA, ±1mA,
±100uA, ±10uA,
±1uA
±1A, ±100mA,
±10mA, ±1mA,
±100uA, ±10uA,
±1uA
±3.5A(≤5V),
±2.5A(≤10V), ±1A,
±100mA, ±10mA,
±1mA, ±100uA,
±10uA, ±1uA
Measure Voltage
Ranges
±1A, ±100mA,
Measure Current
±10mA,±100uA,
Ranges
±10uA
15-3
• Continued
next page
➟ notice.
All specifications
are subjecton
to change
without
High Precision Source Measure Unit
0.02% reading +
0.01% F.S.
Force Current
Accuracy
0.1% reading + 0.1% F.S.
(1A Range)
0.05% reading + 0.05%
F.S. (<1A Range)
Measure Current
Accuracy
0.1% reading + 0.1% F.S.
(1A Range)
0.05% reading + 0.05%
F.S. (<1A Range)
Wideband Source
Noise
Measurement
Sampling Rate
Measurement Log
Output Profiling
Trigger Input
Trigger Output
Floating Output
Master/Slave Mode
Programmable
Resistance
Regulatory
Compliance
52405e-25-3 *1
0.05% reading + 0.008% F.S. (≥500mV Range)
0.05% reading + 25uV (<500mV Range)
0.1% reading + 0.1% F.S. ( >1A Range)
0.05% reading + 0.05% F.S. ( ≤1A Range)
0.05% reading + 0.008% F.S. (≥500mV Range)
0.05% reading + 25uV (<500mV Range)
0.1% reading + 0.12% F.S. ( >1A Range)
0.05% reading + 0.05% F.S. (≤1A Range)
< 30 mV pp 20Mhz BW No Load
600K Samples/s
100K Samples/s
5 Wires (±Force,
6 Wires
(±Force, ±Sense, ±Guard)
±Sense, +Guard)
Power
Battery Test &
Passive
Electronics Automation Component
Output Connection
52405e-25-1 *1
Automated
Optical Inspection
0.02% reading +
0.01% F.S.
52405e-10-2 *1
Photovoltaic Test
& Automation
Measure Voltage
Accuracy
52405e-5-3 *1
Optical
Devices
Force Voltage
Accuracy
52401e-25-200m
0.05% reading +
0.0076% F.S.
(≥500mV Range)
0.02% reading + 25uV
(<500mV Range)
0.05% reading +
0.05% F.S.
(≥2uA Range)
0.05% reading + 200pA
(<2uA Range)
0.05% reading +
0.0076% F.S.
(≥500mV Range)
0.05% reading + 25uV
(<500mV Range)
0.05% reading +
0.05% F.S.
(≥2uA Range)
0.05% reading + 200pA
(<2uA Range)
Flat Panel
LED/
Display Lighting
52401e-6-1
32K Samples/channel
65535 Steps
Programmable 4 Ch
1 Ch
Programmable 8 Ch
No
Yes
No
Channel Isolated
Yes
Yes
No
Yes
CE/FCC
Electrical
Safety
Note *1 : If chassis has less than 38.2W/slot, then the below output limitations apply.
2.5Amp range = 50% on duty cycle, 500mSec maximum continuous on time
3.5Amp range = 40% on duty cycle, 500mSec maximum continuous on time (1250mSec off during maximum on time case)
If the PXI-SMU card is over temperature, it will automatically disconnect output to protect the unit.
Note *2 : Required Voltage Range 48V ± 5% ; Required Voltage Noise ≤ 100mVpp
All specifications are subject to change without notice.
Semiconductor/
IC
PXI Test &
Measurement
ORDERING INFORMATION
15-4
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
52401e-6-1: High Precision Source Measurement Unit, 6V/1A
52401e-25-200m : High Precision Source Measurement Unit, 25V/200mA
52405e-5-3 : High Precision Source Measurement Unit, 5V/3.5A
52405e-10-2 : High Precision Source Measurement Unit, 10V/2.5A
52405e-25-1 : High Precision Source Measurement Unit, 25V/1A
52405e-25-3 : High Precision Source Measurement Unit, 25V/3.5A
A524006 : External AC-DC Power Adapter (drives up to 3x 52401e or 1x 52405e SMUs)
A524011 : High Power External AC-DC Adapter (drives up to 3x 52405e SMUs)
A524009 : 52405e Output Triaxial Cable
All specifications are subject to change without notice.
Video &
Color
Model Name
Model 52400e/52400 Series
Device Power Supply
Model 52310e Series
Systems Alliance
KEY FEATURES
■ 4 Isolated channels of ±6V, 1 A (max)
■ 20-bit measurement resolution
■ Low output noise
■ Maximum sampling rate of 600 KS/s
■ Deterministic output by hardware sequencer
■ Programmable output resistance
■ 8 selectable control bandwidths
■ Master/Slave operation
■ Drivers with LabVIEW/ LabWindows & C/C# API
■ Soft panel GUI
■ PXI Express Peripheral Module
(X1 PCI Express Link)
APPLICATIONS
C h ro m a 52310e s e r i e s i s a p ro gra m m a b l e
PXI-Express DPS (Device Power Supply) Card
designed for high-accuracy and reliable output
power for device test applications. Its compact
size, easy level of integration, and high flexibility
make the 52310e series ideal for multi-channel
power supplies.
A versatile soft front panel and C / C# / LabVIEW
/ LabWindows APIs are provided for rapid
test development and deployment. The back
connector is compatible with both PXIe and
hybrid chassis slots. All of these features enable
easy integration to PXIe or PXI-hybrid systems
designed for a wide range of applications.
Chroma 52310e series features 8 selectable
control bandwidths to ensure high speed
output and stable operation; multiple current
measurement ranges with a 20-bit DAC/ADC
provide the highest resolution and accuracy with
a sampling rate up to 600K S/sec; programmable
internal series resistance for battery simulation.
Chroma 52310e series programmable device
power supplies are designed specifically for
test applications that demand precision output
voltage/current and tightly coupled measurement
capabilities. It provides a cost-effective solution
ideal for a broad range of design and production
applications such as semiconductor and
components manufacturing.
Chroma 52310e DPS series has a patented
hardware sequence engine that has deterministic
t i m i n g t o c o n t r o l e a c h D P S c h a n n e l. T h e
sequencer's on-board memory can store up to
1024 sequencer commands and 32k measurement
samples per channel.
ORDERING INFORMATION
52314e-6-1 : Device Power Supply
Each 52310e DPS card can be configured to
load-share by connecting channels in parallel. This
enables users to achieve higher output currents
on the same card.
■ Semiconductor
■ Components Manufacturing
SPECIFICATIONS
Model
Slot
Output Channels
Source Power
Max. Current
Input Voltage
Output Isolation
Bits Resolution
Programmable Loop Bandwidth
Force Voltage Ranges
Measure Voltage Ranges
Measure Current Ranges
Force Voltage Accuracy
Measure Voltage )Accuracy
Measure Current Accuracy
52314e-6-1
1
4
6W peak (3W continuous) x 4
1A Max (Surge capability)
PXI-Express backplane power
Isolated, but share a common LO
20 bits for measurement; 16 bits for programming; 16 bits for current clamping
8
±6V
±6V
1A, 100mA, 10mA, 1mA, 100uA, 10uA
0.02% reading + 0.01% F.S.
0.02% reading + 0.01% F.S.
0.1% reading + 0.1% F.S. (1A)
0.05% reading + 0.05% F.S. (<1A)
<50mV pp 20MHz BW Full Load
600K Samples/second for both V & I
Up to 1 ohm (1A range); Up to 10 ohm (100mA range)
Channels must be on the same DPS card (1A range only)
4-Wire (±Force / ±Sense)
32K Samples per channel
1024 Steps per channel
Output Voltage Ripple & Noise
Measurement Sampling Rate
Programming Output Resistance
Output Ganging
Output Connection
Measurement Log
Output Profiling
Digital In
Programmable 4 CH
Digital out
Master/Slave Mode
Yes
Programmable Resistance
Yes
Control Interface
PXI-Express
Regulatory Compliance
CE/ FCC
* Unless otherwise noted, specifications are only valid under the following conditions:
Ambient temperature 23 °C ± 5 °C; After 30 minutes warm-up period; Self-calibration performed within the last 24 hours.
15-5
All specifications are subject to change without notice.
Programmable DC Power Supply
Model 52912/52914
Video &
Color
15-6
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
PXI Test &
Measurement
Channel #1 : 0 ~ 48VDC, 2A MAX., 60W
Channel #2 : 0 ~ 48VDC, 2A MAX, 60W
Voltage Accuracy
0.5% of programmed value ±50mV
Voltage setting resolution
12 Bits
Line Regulation
0.1%
Load Regulation
0.1% (10% to 90% load change)
Peak transient less than 150mV and return to within 5% less than 2ms
Transient Response
following 20% load change. (Test Condition: [email protected]~1.8A, [email protected]~
(20MHz)
1A) at 25˚C
Current Limit Accuracy
0.5% ± 50mA (12 Bits Resolution)
Voltage: ±0.2% of Reading + 60mV
Read back
Current: ±0.5% of Reading + 10mA
Rise Time
< 50 ms (10% ~ 90%)
Efficiency
84% typical
Measurement Function
Maximum sampling rate
5K S/s of each channel
Input Impedance
5kΩ
Trigger sources
Software, external
Buffer size
2K samples per channel
Data transfers
Polling
Sequence Function
Trigger sources
Software, external
Input Impedance
3.78kΩ
Buffer size
256 command words per channel
Input
DC Input
Isolated + 56VDC (dual)
-100V ~ 240VAC, 50 or 60 Hz
AC Input
100 ~ 240VAC, 50 or 60 Hz
(Optional A529102)
• VISA compatible via National Instrument's VISA 2.5 or above
Software API
• 20 Windows DLL's API
PCI V2.2 compliant, 33MHz, 32 Bits
PCI Data BUS
0˚C ~ 55˚C
Operating Temperature
10% ˜ 90 % relative
Operating Humidity
-30˚C ~ 70˚C
Storage Temperature
Isolation
Channel to Channel
500V
Channel to Chassis
500V
• PXISA PXI 2.0
Standards
• PICMG 2.0 R3.0 CompactPCI
Voltage/Current/Power
Semiconductor/
IC
Input Power
To avo id exce ss powe r d raw fro m t he PX I
b a c k p l a n e, t h e 52912 d r a w s i n p u t p o we r
(+56VDC) via front panel connections. This
approach not only minimizes power required
52914
3-Slot, 10x16cm
Electrical
Safety
Power Levels
The 52912/52914 Programmable power
supplies provide two independent and
isolated 60W (MAX) power supplies, and each
channel is programmable from 0-48VDC to
a maximum of 2.0 Amps. The 52912/52914
include programmable current limit to protect
critical UUT's from excessive current, output
will automatically switch into constant current
mode when limit is reached. For greater power or
voltage applications, channels can be connected
in series.
52912 (CE)
1-Slot, 10x16cm
A529102
Power
Battery Test &
Passive
Electronics Automation Component
Measurement Function
In operation, the measurement capabilities
include quickly sourcing I/V and then measuring
I/V automatically without processor intervention.
The 52912/52914 has built-in hardware sequence
list that can execute command and store data
in FIFO without processor action. With the tight
integration of a Chroma 52912/52914, you'll
get high speeds for high throughput and high
measurement accuracy and repeatability for yield
integrity.
SPECIFICATIONS
Model
Dimensions
Output
Automated
Optical Inspection
C h r o m a 52912/52914 p r o g r a m m a b l e D C
power supplies are designed specifically for
test applications that demand precise output
voltage/current and tightly coupled measurement
capabilities. Chroma 52912/52914 provides
you a good return on investment. The versatile
design and world-class performance of Chroma
52912/52914 make them ideal for a broad range
of design and production applications in markets
as diverse as communications, semiconductor,
and components manufacturing.
Compliant to PXI and cPCI Standards
The 52912/52914 Programmable power
supplies comply with the latest PXI Revision
2.0 specifications of the PXI System Alliance
(PXISA) as well as the CompactPCI specifications
as defined by the PCI Industrial Computer
M a n u f a c t u r i n g G r o u p (P I C M G). T h u s, t h e
52912/52914 may be used in either PXI or
CompactPCI mainframes.
Photovoltaic Test
& Automation
KEY FEATURES
■ Dual Isolated outputs; 0-48VDC/ 2A MAX./ 60W,
programmable
■ Direct Universal AC input via front panel
(Model 52914)
■ External Trigger function
■ Programmable current limit
■ Over voltage, over current and short circuit
protection
■ Remote Voltage Sense
■ 16 Bit read back voltage and current at output
■ Supplies can be connected in series
52912 : PXI/cPCI Programmable DC Power Supply
(DC Input)
52914 : PXI/cPCI Programmable DC Power Supply
(AC Input)
A529102 : AC/DC Adapter (for Model 52912)
Optical
Devices
0~48VDC/2AMP/60W
ORDERING INFORMATION
Flat Panel
LED/
Display Lighting
Systems Alliance
from the backplane but also maintains complete
isolation between backplane logic and power
conversion circuitry for noise immunity. For
applications where +56VDC is not available,
Chroma 52912 provides an optional AC-DC
adapter which allows the instrument to be
operate from 100~240VAC mains. Chroma 52914
incorporates the AC-DC converter circuit on
board. Universal power (100~240VAC) is applied
to the front panel directly in order to produce the
dual isolated programmable outputs.
Extension Card
Model 52906
Systems Alliance
KEY FEATURES
■ Extend PXI backplane signals
■ 3U 64-bit PXI extension card available for hot
swapping PXI card
■ Extend PXI BUS to outside of chassis, easy for
inspection
■ Able to use voltage meter to measure the
power consumption of +5V, +3.3V, +12V,-12V
and VIO
■ Use Jumper to control the cutoff current
■ Power is controlled by mechanical switches
■ Provide external power device
■ Provide short circuit protection
The function of PXI extension card is to extend
the PXI backplane signal outside of the chassis.
Inserting the PXI card to extension card can
easily check or measure the PXI card's signal
under power on condition, which resolves the
problems of inconvenient inspection due to the
PXI card inside the chassis for RD or maintenance
personnel. PXI extension card is able to isolate
the voltage and signals sent to the PXI card for
hot swap when the system is powered on. Every
time the extension card activates it can supply the
power required for PXI initialization. It eliminates
the need for rebooting PC when users read and
re-write the configuration files.
PXI extension card allows users to measure the
voltage consumption power of PXI standard 5
sets voltage easily using the voltage meter. The
extension card has over current protection circuit
that can prevent the system backplane and other
related components from damage once the PXI
card malfunctions. Jumpers on the extension
card are available for users to define the current
range for protection; in addition an outward
power connector is attached to supply the power
externally instead of using the backplane power.
SPECIFICATIONS
Model
BUS
Input Requirement
Input for UUT
Output Current Limit
Protection
Output Voltage Drop
Propagation Delay
UUT ON-OFF Controls
Outputs
Current Sense Accuracy
Mechanical Dimensions
15-7
ORDERING INFORMATION
52906 : Extension Card
Test Board
52906
PXI / Compact PCI 32 or 64 bit
5V at 250 mA, 12V at 100 mA, -12V at 100 mA
From chassis or the external power, configurable by jumpers for each
power source
5V, up to 5 Amps, 3 limitations jumper selectable
3.3V, up to 3 Amps, 3 limitations jumper selectable
VIO, up to 2 Amps, 3 limitations jumper selectable
12V, up to 1.25 Amps, 3 limitations jumper selectable
-12V, up to 1 Amp, 3 limitations jumper selectable
0.07 volts drop for every 1 Amp drawn for 5V, 3.3V;
0.1 volts drop for every 1 Amp drawn for VIO;
0.25 volts drop for every 1 Amp drawn for 12V;
0.15 volts drop for every 1 Amp drawn for -12V
Less than 500 pico-seconds from the PC BUS to the UUT.
(Switch propagation delay is rated at 250 Pico-seconds)
Via SPDT switch on-board
Current draw by the UUT can be measured at connector J5
for 5V, 3.3V, 12V, -12V and VIO.
Each volt represents 1 Amp.
Typical below 10% for 5V, 3.3V, 12V, and VIO; below 15% for -12V
100 x 220 mm (3U high)
All specifications are subject to change without notice.
Video &
Color
Flat Panel
LED/
Display Lighting
Optical
Devices
Photovoltaic Test
& Automation
Automated
Optical Inspection
Power
Battery Test &
Passive
Electronics Automation Component
Electrical
Safety
Semiconductor/
IC
PXI Test &
Measurement
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
15-8
All specifications are subject to change without notice.
General Purpose Test Solution
Thermal/Multi-function Data Logger
TEC Controller
6½ Digital Multimeter
16-1
16-4
16-7
Wi-Fi /Bluetooth /LTE Tester
16-9
RF ATE Test Equipment
16-10
Multi-Channel GPS Simulator
16-11
Single channel GPS/GLONASS Simulator
16-12
RF Recorder/Player
16-13
Wireless Communication Test System
16-14
Thermal/Multi-function Data Logger
TEC Controller
Overview
6½ Digital Multimeter
Wi-Fi /Bluetooth /LTE Tester
RF ATE Test Equipment
Multi-Channel
GPS Simulator
Single channel
GPS/GLONASS Simulator
RF Recorder/Player
Wireless Communication Test System
Thermal/Multi-function Data Logger
8/64 channels
KEY FEATURES
■ Models with 8 and 64 channels on-line
data recording. Multi-sets linked to a PC for
hundreds of channels are doable
■ Support B, E, J, K, N, R, S, and T type thermal
couples with ITS-90 defined temperature range
■ Individual channel cold junction compensation
with <±0.3˚C accuracy
■ Temperature resolution up to 0.01˚C, error
down to ±(0.01% of reading+0.3˚C)
■ VA-480 voltage adaptor :
Voltage range ±480VDC ; Resolution 1mV ;
Accuracy 0.1% of reading+1mV
■ VA-10 voltage adaptor :
Voltage range ±10VDC ;
Resolution 100uV ;
Accuracy 0.05% of reading+500uV
■ 1000VDC channel to channel isolation,
full protection for testing points
with charge and guarantee for accurate
measurements
■ Thermal couple open circuit detection
■ PC-based operation with powerful software for
recording and analyzing data
■ 8 channel model is USB powered. No battery or
external power supply is required
It is a general requirement to record temperatures,
voltages, currents, and many physics quantities
d u r i n g r e s e a r c h, p r o d u c t d e v e l o p m e n t,
productions, and quality assurance processes. The
number of record channels can be a simple one
to several complicated set of hundreds. Thermal/
multi-function data loggers are prefect solutions
to serve for these measurement and tracking
needs.
There are several measurement products in
the market to perform such a large-scale and
extensive time varying recording. Some are
expensive, some are limited in accuracy or
resolution, and some have low immunity to
interference. Chroma thermal/multi-function
data loggers are by far the most cost-effective
solutions for versatility, accuracy, stability, and
interference immunity among this category.
Model 51101/51101C Series
example, they support 8 types of thermal couples
measurement with ITS-90 defined temperature
range at 0.5˚C accuracy and 0.01˚C resolution*,
while most data loggers in the market are at 1 ˚C
accuracy and 0.1˚C resolution*. Chroma loggers
are with 1000VDC channel to channel isolation,
which means they can attach thermal couples
to objects with high electricity, such as batteries,
solar cells, working PCB, etc., and still get correct
data. Many competitors are just malfunctioned
or even damaged in those cases. Data retrieve
in Chroma loggers are in a parallel architecture,
while most of competitors use a sequential
multiplexing method. This means data rate per
channel is quick and constant for Chroma loggers,
while others become much slower when number
of channels is bigger.
Using Chroma thermal/multi-function data
loggers, customers get confidence in measured
data and high Performance/Cost ratio. Most of all,
we can help in certain cases that our competitors
fail, and only Chroma succeeds.
* Thermocouple error excluded. Please see
specification list for detail.
1000VDC channel to channel isolation
In developing or qualifying some electronic
devices, track ing records of temperatures/
voltages/currents are required. Many cases there
can be high voltage difference between measured
points. A switching power supply, for example,
is required to measure the primary side voltage/
current, secondary side voltage/current, and key
component temperatures. Unfortunately, many
data loggers including some leading brands are
incapable to handle such a high voltage difference
between both sid es. Few hundred voltage
difference can mess up their measurement totally,
or even kills their loggers.
Chroma thermal/multifunction data loggers are
perfect for the measurements in a situation with
charge and high voltage difference. The feature
of 1000VDC channel to channel isolation makes
them immune to voltage difference between any
two channels. One just attaches thermal couples
or wires on the device or conducting pads and
gets accurate data.
Another case can be battery system tests. One
needs to know the voltage and temperature
of each cell. For other data loggers, often the
voltages cannot be measured properly in the
cascade configuration. The thermal couple
Coil temperature
power device temparature
Chroma thermal/multi-function data loggers
measure temperatures, voltages, and currents
w i t h h i g h a cc u r a c y a n d re s o l u t i o n s. Fo r
Primary side voltage
primary side current
16-1
8 channels
Multi-channel Data Logger
Secondary side voltage
Secondary side current
attachment is another issue needing special care.
All these problems are easily solved using Chroma
thermal/multi-function data loggers for the high
channel to channel isolation.
0.5˚C accuracy and 0.01˚C resolution
For the same or even lower prices, Chroma
thermal/multi-func tion data logger offers
higher accuracy and better resolution than our
competitors do. While most of data loggers are at
1˚C accuracy and 0.1˚C resolution, Chroma data
loggers are 1 order better than theirs. It is always
true the more accurate and seeing more details,
the better for measurements.
In order to achieve such high accuracy and
resolution, Chroma implements individual CJC for
each channel. High bit-count A-to-D converters
and advanced noise suppression circuit makes
outstanding performance for these data loggers.
The best of all is that customers can enjoy better
specifications without paying more.
Precise temperatures can be critical in thermal
conductivity measurements, chemical processes,
and biologic experiments. Testing a heat pipe,
for example, often requires resolving <1˚C
temperature difference between evaporation
and condensing zones. Some liquid crystals
can change their properties drastically with
a very small temperature variation at critical
temperatures.
Constant data rate per channel
M o s t o f d at a l o g g e r s i n t h e m a r k e t u s e a
multiplexing circuit structure. All channels share
a bandwidth which means the more active
channels, the slower data rate per channel will be.
Chroma data loggers use a parallel data retrieving
circuit structure. No matter how many channels
are active, the data rate can be as fast as 5 samples
per second per channel.
All specifications are subject to change without notice.
Thermal/Multi-function Data Logger
X
X
X
X
X
X
CH4
Time
X
X
X
CH1
CH3
CH4
Data Histogram
X X X
X X
X X X XX X
X
X XX X
X
X
X X X X X X Time
X
X X X XX X X X X
XX
X X XX
X X X XX
X
X X
Applications
■ Automotive & Aircraft
■ Electrical & Electonics
■ Solar Energy
■ Power
■ Machinery
■ Iron & Steel
■ Metals & Mining
■ Oil & Gas
■ Water & Waste
■ Chemical
■ Pharmaceutical & Food
■ Others
Main panel
What CHROMA data loggers see
constant rate each channel.
Sample rate per channel = constant
Power
Battery Test &
Passive
Electronics Automation Component
CH2
Data panel
Automated
Optical Inspection
What other data loggers see,
more channels, slower rate each channel
bandwidth
Sample rate per channel =
number of channels
Using the PC software, one can see the detail of
all the curves, change drawing time and range
scales, create marks, zoom in selected sections, and
perform difference calculations, all in few simple
steps. The PC RAM is used as buffer to store every
data since the logger is powered on, making data
tracking back possible without opening the record
file. Size of data recording is determined by hard
disk free space, which is almost unlimited.
Photovoltaic Test
& Automation
CH3
X
X
Optical
Devices
CH2
X
Powerful data recording and analyzing
through a PC
Personal computers and Notebooks are powerful
for their fast calculation and data processing
capability, friendly graphic user interface, and
huge hard disk storage. While operation of many
other data loggers are limited by their small
display and memory, Chroma data loggers link to
PCs or Notebooks for direct display, analyses, and
storage.
Flat Panel
LED/
Display Lighting
CH1
Video &
Color
The benefit of constant data rate can be profound
for recording large number of channels. For tens
of channels, total data bandwidth of Chroma data
logger can be several times larger than that of
other data loggers. Some other data loggers can
become too slow and lose details. They can miss
recording critical changes happen in a short time.
Chroma data loggers greatly reduce this possibility.
Model 51101/51101C Series
51101-8
51101C-8
Model
-200 to 400˚C
-200 to 1372˚C
250 to 1820˚C
-200 to 1000˚C
-210 to 1200˚C
-200 to 1300˚C
-50 to 1760˚C
-50 to 1760˚C
Maximum Sample Rate
Channel to Channel Isolation
Input Resistance
Thermocouple break detection current
All specifications are subject to change without notice.
B, E, J, K, N, R, S, or T mini-type
B, E, J, K, N, R, S, or T mini-type
8
64
Thermocouple : B, E, J, K, N, R, S, T
ITS-90
±0.01 ˚C
51101 Series : ±(0.01% of reading +0.3) ˚C
51101C Series : ±(0.01% of reading +0.8) ˚C
51101 Series : ± 0.3˚C
51101C Series : ± 0.8˚C
5 sample/sec.
1000VDC/750 Vrms
5MΩ
100 nA
• Continued on next page ➟
16-2
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
CJC Error
51101 Series : ±(0.01% of reading +0.3) ˚C *1
51101C Series : ±(0.01% of reading +0.8) ˚C *1
PXI Test &
Measurement
Temperature Accuracy *1*2
51101-64
51101C-64
Semiconductor/
IC
Thermocouple
Thermocouple T-type
Thermocouple K-type
Thermocouple B-type
Thermocouple E-type
Thermocouple J-type
Thermocouple N-type
Thermocouple S-type
Thermocouple R-type
Thermocouple Jacks
Thermocouple Connector
Temperature Reading
Number of Inputs
Temperature Sensor Type
Temperature Scale
Temperature Resolution
Electrical
Safety
SPECIFICATIONS
Thermal/Multi-Function Data Logger
Model 51101/51101C Series
51101-8
51101C-8
51101-64
51101C-64
Number of Digital I/O
--
Digital Input
--
Digital Input- High Input Voltage
Digital Input- Low Input Voltage
Digital Input- High Input Current
Digital Input- Low Input Current
Digital Input- Terminal Resistor
Digital Output Configuration
Digital Output- External Supply Voltage
Digital Output- ON-state Voltage
Digital Output- ON-state Current
Digital Output- OFF-state Current
Digital Output- Power Dissipation per Output
Isolation Voltage
Communication
RS-232
------------
4 differential digital inputs
and outputs
1 trigger input(DI0) and
3 general purpose inputs
3 ~ 30 V
< 0.8 V
0.8 ~ 13.1 mA
<10μA
2.2KΩ
transistor switch
<30 V
<1.5 V
<400 mA
<2.1 μA
<0.6 W
Model
Digital I/O
±250 V
USB
LAN
Power Specifications
Power Requirement
Maximum Power Consumption
Physical Specifications
Dimensions (WxDxH)
Weight for Main Frame
Weight per Sensor Card
Weight (Main Frame + 8 Sensor Card)
Environmental specifications
Operating Temperature *1*2
Humidity
-USB2.0 (full speed device) ;
USB B-type connector
--
Half Duplex, DB-9 female connector
4.5~5.5 V
1.2W
11.4~12.6 V
18 W
135.3 x 186 x 51.7 mm
1.2 Kg
---
277 x 200.7 x 233 mm
2.4 Kg
0.15 Kg
3.6 Kg
10/100 Mbps
0~50˚C
< 80 %RH
Power Adaptor Input Voltage
--
Power Adaptor Input Frequency
--
47 to 63 Hz
-±1.2 V
12.6 V/1.5 A
±1.2 V
Main Frame DC Input
Thermocouple Differential Input Voltage Limit
Operating Temperature
Storage Temperature
Storage Humidity
Voltage Reading
Voltage Input Type
Voltage Resolution
Voltage Input Range
Voltage Input Accuracy
Input Resistance
Current Reading
Current Input Type
Current Resolution
Current Input Range
Current Input Accuracy
90 to 260 VAC
0~50˚C
-20~60˚C
80 %RH
VA-480 Voltage Adaptor
1mV
±480VDC
±(0.1% of reading + 1mV)*3
1MΩ
VA-10 Voltage Adaptor
100uV
±10VDC
±(0.05% of reading + 500uV)*3
300 KΩ
IA-3 Current Adaptor
1mA
±3A
±(1% of reading + 1mA)
Voltage/Current Adaptor
Thermocouple
Note *1 : Measure after heat equilibrium is reached and the uncertainty of thermocouple itself is excluded. Operating temperature within 20˚C to 30˚C range.
Note *2 : For operating temperature out of range from 20˚C to 30˚C, additional error ±[ (0.01% of reading + 0.03˚C) x (T-25˚C) ] will be added. T is the
ambient temperature.
Note *3 : Under MV_8 filtering mode
Note *4 : Model 51101-64/51101C-64 with LAN module
ORDERING INFORMATION
51101-8 : Thermal/Multi-Function Data Logger - 8 channel
51101C-8 : Thermal/Multi-Function Data Logger - 8 channel
51101-64 : Thermal/Multi-Function Data Logger - 64 channel
51101C-64 : Thermal/Multi-Function Data Logger - 64 channel
16-3
A511000 : VA-480 Voltage Adaptor (option)
A511001 : IA-3 Current Adaptor (option)
A511002 : VA-10 Voltage Adaptor (option)
A511003 : 8-port sensor card with package
A511004 : C8-port sensor card with package
All specifications are subject to change without notice.
TEC Controller
Excellent Thermal response, temperature
precision, and control stability
TEC module is a bi-direc tional heat pump
controlled by current. So a temperature control
system with TEC modules can reach temperatures
higher or lower than ambient. Compared with
traditional temperature control methods, the
54100 provides a compact, fast responding,
solution to thermal control applications.
Using Chroma's TEC methord, speed of heating
and cooling is about 5~60℃ per minute.
Thermal
Platform
Target Temp.
change rapidly
Time
High TEC driving capability is another merit of
Chroma's 54100 controllers. Currently two modles
All specifications are subject to change without notice.
Chroma's Advanced TEC Controllers are thermal
couple based and with temperature accuracy*
0.3℃ and resolution down to 0.01℃. Users can
take advantage of a wide range of thermal couple
for easy measurement setup, while maintaining
high accuracy and resolution. This means users
can achieve test results with high repeatability,
high accuracy, and therefore high confidence.
Temp.
Stability
±0.01℃
25
Time
Chroma 54100 Series
• Continued on next page ➟
16-4
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
High Driving Capability
There were many low output power TEC
controllers on the market mainly for small devices
and small scale lab tests. As technologies grow,
higher TEC driving power is required in many
modern applications. For example, testing solar
cells larger than 4 inch square from -20℃ to 85℃
requires more than 100W driving power and
thermal loads of sunlight can add 30W or more.
Designers of high power LEDs must have great
concern about their thermal properties. 30 W-LED
module testing from -20℃ to 150℃ also demands
high driving power.
High temperature accuracy and resolution
TEC controllers using thermal couples currently
on the market usually have accuracy of only
about 1℃ and poor resolution (0.1℃). This is
inadequate for many modern applications. For
example, rating solar cell power efficiency requires
temperature accuracy much better than 1℃ since
phase changes of some solar materials can occur
within 0.1℃ or less. Some biochemical process
can be very sensitive to temperature variations as
well. Thermal resistance measurements of heat
pipes often results in a temperature deviation
much less than 1℃. Some high resolution
TEC controllers are using different types of
temperature sensors, such as RTD, temperature IC,
or thermistors. Unfortunately, these temperature
control methods often cannot provide direct case
temperate control/contact and can be too bulky
for measuring at the point of interest.
PXI Test &
Measurement
Start ing Temp.
other
TEC controller
Semiconductor/
IC
Temp.
TEC modules
Electrical
Safety
TEC Controller
60W
Power
Battery Test &
Passive
Electronics Automation Component
Chroma's Advanced TEC Controller is specially
designed for optimal performance. Changing
temperature from one value to another rapidly
without overshoot are primary benefits of the
54100 series. Effects of thermal perturbations by
the unit-under-test can even be minimized up
to 100W on/off, by the 54100 and often reduces
temperature variation to less than 1℃ within few
seconds. If temperature stability is concerned,
Chroma's Advanced TEC Controllers offer 0.01℃
stability in almost most applications.
Chroma 54100 Series
Automated
Optical Inspection
Another important feature of Chroma's 54100 TEC
Controllers is its true auto tune function providing
for optimum control and temperature response.
Stability down to the temperature resolution of
0.01℃ is regularly achieved regardless of the size
and geometry of thermal platforms.
800W
Photovoltaic Test
& Automation
Chroma's Model 54100 series of advanced TEC
Controllers provide an excellent temperature
monitoring engine via two thermal couple
inputs. The cold junction of the engine is
internally stabilized to 0.001℃, providing 0.01℃
temperature resolution. The TEC driver circuit
within the 54100 uses a filtered PWM architecture
which provides much higher drive currents over
ordinary PWM drivers and provides smooth
current modulation which is critical for electromagnetic sensitive measurements.
* Operation temperature range of platform is
independent with TEC controller range, and
proper platform design should be considered to
obtain certain temperature.
Optical
Devices
A thermoelectric cooler (TEC) module is a solid
state device which can control heat flux using
current. First discovered in the 19th century
and called the Peltier effect, TEC’s operate by
electrical current flow between two dissimilar
conductors. Depending on the direction of the
flow heat will be either absorbed or released.
This technology is very useful for small scale
temperature control; providing fast temperature
response and ultra-high temperature stability.
TEC temperature control equipment is also very
compact and energy efficient in comparison to
conventional thermal chambers. TECs have the
added advantage of control case temperatures
directly and have mechanical moving parts.
Chroma's Advanced TEC Controllers can deliver
150W, 300W, 800W driving power, satisfying needs
of both small to large platforms. Another benefit
of high driving power is that in many applications
several units can be driven from a single TEC
controller reducing costs and test times.
Flat Panel
LED/
Display Lighting
KEY FEATURES
■ Bidirectional driving with 150W (24V/8A),
300W (27V/12A), or 800W (40V/20A) output
■ Filtered PWM output with >90% driving
power efficiency while maintaining linear
driving with current ripples<20 mA
■ Temperature reading and setting range
-70 to 250℃with 0.01℃resolution and
0.3℃ absolute accuracy
■ Short term stability (1 hour) ±0.01℃ and
long term stability ±0.05℃ with optimal
PID control
■ Feature true TEC large signal PID auto tune
for best control performance
■ 2 T-type thermal couple inputs, one for
control feedback and the other for monitor
and offset, providing versatile control modes
■ RS232 serial communication port for PC
remote operation and thermal data recording
■ Powerful and user-friendly PC program
available
■ Perfect matching all Chroma designed
temperature controlled platforms
are available (150W and 300W) with 800W under
development. More TEC driving power means
wider temperature range, faster temperature
response, and larger platform applications. For
comparable accuracy and stability, Chroma offers
one of the best TEC driving power-to-price ratio in
the market.
Video &
Color
150W/300W/800W
Model 54100 Series
TEC Controller
Model 54100 Series
True large-signal PID / auto tune for TEC
control
PID control is an important feature for a good
controller. The PID parameters basically describe
the dynamic response of a system and can be
very different from one to another. A guarantee
of successful control cannot be achieved without
setting proper PID parameters and setting PID
parameters manually is very time consuming.
Chroma 54100 provides an advanced PID auto
tune feature making PID setting fast, repeatable
and easy.
Solar Cell
Many other TEC controllers use a small signal and
one-directional temperature transient to find
PID parameters. This auto tune method is OK for
heater only temperature control, but is not always
successful for TEC control. In order to truly match
the thermal response of a TEC control system,
Chroma's Advanced TEC Controllers use a largesignal and bi-directional driving method for PID
auto tune. This proprietary method results in the
superb temperature control behavior which is
fast, precise, and very stable. While some other
TEC controllers require a set of PID parameters
for every 20℃ inter val, Chroma's Advanced
TEC Controllers need only a set of optimal PID
parameters (usually auto tuned at 40~50℃) to
cover all operation from -40 to 150℃.
LED Integrated Sphere
Temp.
Micro Projector
SV
PID control chroma
Convention on/off control
Time
Temp.
SV
PID auto tune & optimized(Chroma)
PID not optimized(others)
Time
Soft Panel
Available for Chroma's Advanced TEC Controller
are graphical softpanels which allow for intuitive
control and measurements. Viewing TEC current
and temperature vs. time curves, recording
data to a file, and running temperature cycling,
ramping sub-programs, etc., are all provided. PID
parameters, current limit, and other important
settings can also be read and set from a pop-up
setup windows.
High Efficiency Standard Platforms
There are numerous TEC platforms be developed
by Chroma for sue with the 54100 TEC Controllers.
Such platforms include LEDs, solar cells, e-paper,
burn-in, and many others. As shown below each
are designs to provide a wide temperature range
with typical temperature stability of 0.01℃.
Wafer Chuck
General Platform
TEC Platform Architecture
E-paper
16-5
All specifications are subject to change without notice.
TEC Controller
Model 54100 Series
54130-27-12
27VDC
12A
300W
-49 to 149℃
-49 to 149℃
T-type thermocouple
0.01℃
<±0.3℃
< ±(0.3+0.002×|T-25|) ℃
RS-232 Half Duplex
-20~60℃
80%R H
241 x 441 x 135 mm /
9.5 x 17.4 x 5.3 inch
Weight
6.3 kg / 13.9 lbs
6.6 kg / 14.6 lbs
9.5 kg / 20.9 lbs
Note *1 : Platform temperature range is highly relating to the structure and design and will need to apply external elements to reach extreme conditions. To
reach below -30 degree, it will need extra coolant. To reach beyond 150 degree, other heating material will need to be considered.
Note *2 : The temperature control stability depends on not only the controller but also platform and environment. The PID parameters must be optimized for
the platform. Avoid any liquid or air turbulence around the platform. Attach the temperature feedback thermocouple firmly with good thermal conductivity.
Shield for electromagnetic interference if necessary. Extremely high control temperature stability can be achieved with all these issue taken care.
Note *3 : Monitoring Temperature Relative Accuracy is defined as the temperature difference between the two thermocouples reading the same thermal
point. It is the working ambient temperature, which must be thermal balance within 20~30℃, and exclude thermocouples error for controller specifications
to be guaranteed. If the operation temperature is out of 20~30℃, the specification will be modified to < ±(0.3+0.002×|T-25|), where T here is the working
ambient temperature.
Dimensions (WidthxDepthxHeight)
362 x 286 x 131.2 mm / 14.3 x 11.3 x 5.17 inch
Electrical
Safety
ORDERING INFORMATION
PXI Test &
Measurement
54115-24-8 / 54130-27-12
16-6
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
All specifications are subject to change without notice.
Semiconductor/
IC
54115-24-8 : TEC Controller 150W
54130-27-12 : TEC Controller 300W
54180-40-20 : TEC Controller 800W
A541151 : TEC Thermal Platform for LED integrated sphere
A541152 : TEC Thermal Platform for LED burn-in
A541153 : TEC Thermal Platform for LED wafer
A541154 : TEC Thermal Platform for e-paper
A541155 : TEC Thermal Platform for solar cell
Power
Battery Test &
Passive
Electronics Automation Component
Storage Temperature
Storage Humidity
1400W
12A/250V
RS-232 Half Duplex ; USB2.0 ;
LAN 10/100Mbps
Automated
Optical Inspection
330W
3A/250V
5~45℃
< 80 % RH
90 to 240 VAC, 50/60 Hz
550W
5A/250V
Photovoltaic Test
& Automation
Temperature Sensor Type
- 70 to 250℃ *1
Standard : T-type thermocouple
Optional : K-type thermocouple
Optical
Devices
Temperature Monitoring
Monitoring Temperature Range
PC Communication Port
- 70 to 250℃ *1
0.01℃
≦0.01℃
≦0.05℃
Short Term
Long Term
Monitoring Temperature Resolution
Monitoring Temperature Relative Accuracy
Monitoring Temperature Absolute Accuracy
Environmental
Working Temperature
Humidity
Power Requirement
Maximum Power Consumption
Fuse
54180-40-20
40VDC
20A
800W
Flat Panel
LED/
Display Lighting
Temperature Control Stability
54115-24-8
24VDC
8A
150W
Video &
Color
SPECIFICATIONS
Model
TEC Output Voltage
TEC Output Current
TEC Driving Output Power
Temperature Control
Setting Temperature Range
Setting Temperature Resolution
6½ Digital Multimeter
Model 12061
Test System Application
For user's convenience Chroma supports various
software and hardware for different control
platforms.
- Chroma 12061 TOOL : It is a real-time display
interface for value monitoring. It can log data and
output in CSV format for analysis.
KEY FEATURES
■ 6½ digits resolution
■ 11 types of measurement characteristics
- DC voltage/current (1000V/3A max)
- AC voltage/current (750V/3A max)
- Resistance 2 or 4-wire ohms
measurement
- Period & frequency
- Diode & continuity
- Temperature (RTD)
■ Various math functions
- NULL
- Max/Min/Avg
- High/Low limit
- Percentage/Ratio/ MX+B
- dB/dBm
■ DC voltage accuracy : 0.0015%
■ AC voltage accuracy : 0.04%
■ Optional Multi-point TC Scanner Card (10ch),
multi-point scanner card (10/20ch)
■ Measurement and data transmission up to
2000 readings/sec (4½)
■ Up to 2000 readings memory storage
■ Standard SCPI control
■ Standard USB & GPIB interface,
support USBTMC
■ Software control support
- Chroma 12061 software
- LabView® Driver
Fast & High Performance
The 12061 6½ Digital Multimeter has assorted
settings of resolution, integration time and ranges
that allow users to optimize the configuration
of measurement speed, resolution and accuracy
when in individual measurement test mode.
Th e 12061 ha s built-in a h igh sp eed, low
interference A/D converter with a maximum
speed of 2000 rdgs/s it is the best solution for high
speed measurement.
Individual Application
C hro ma 12061 e quippe d w ith 11 t y p es o f
measurement functions containing DC voltage/
current, AC voltage/current, resistance 2/4-wire
ohms, period, frequency, diode, continuity and
temperature as well as diverse math functions of
NULL, Max/Min/Avg, High/Low limit, High/Low
limit, Percentage/Ratio/MX+B, dB/dBm and etc.
Along with trigger and memory function, Chroma
12061 is the right tool for you to perform the basic
measurement.
16-7
- Chroma 12061 LINK : It can send the data to PC
directly in real time and save it to EXCEL or WORD
format file as well as create the data pattern. Test
engineers can use ActiveX components to control
the 12061 using SCPI commands.
Multi-Point Scanner Card (10CH/20CH)
C h r o m a 6½ D i g i t a l M u l t i m e t e r s u p p o r t s
Multi-point Scanner Card which is a scanning
measurement tool not supported by most of the
6½ Digital Multimeters in the field.
Multi-point Scanner Card offers multiplexing ten
two poles (ACV, ACI, DCV, DCI, Resistance, Period,
Frequency) that can be installed to the extension
card option directly on the rear panel.
Scanner Card Configuration
Channel 1
Channel 2
Channel 3
Channel 4
Channel 5
HI
LO
HI
LO
HI
LO
HI
LO
HI
HI
LO
LO
HI
LO
4-Pole
Application Softpanel - CHROMA 12061 LINK
PASS/FAIL signal output
Chroma 12061 can provide PASS/FAIL signal to
system by USB port (either communication or
PASS/FAIL signal) with high/low limit set. USB type
B female connect to system with signal (1 floating/
2 PSS/ 3 FAIL/ 4 GND) in 2ms low and please
disable USB interface. If result over the high/low
limit, the beeper will alarm and signal output.
(Beeper can be off )
Channel 6
Channel 7
Channel 8
Channel 9
Channel 10
OUT A
OUT B
2-Pole
HI
LO
HI
LO
HI
LO
HI
LO
HI
LO
Multi-Point TC Scanner Card (10ch)
The multi-point temperature scanning card
has multiple functions including 2-wire/4-wire
resistance, AC/DC voltage/current, frequency,
period and temperature measurements. As
cold junction compensation is equipped for
temperature measurement, it increases the
measurement accuracy greatly. In addition, it can
scan the temperature of 10 different channels
that can be applied extensively to electronic
devices and industrial studies for temperature
measurement
ORDERING INFORMATION
12061 : 6½ Digital Multimeter
A120000 : Multi-point Scanner Card (10ch)
A120001 : Thermal-measurement Adapter
A120002 : Multi-point Scanner Card (20ch)
A120003 : HV Probe (1000:1)
A120004 : Multi-point TC Scanner Card (10ch)
All specifications are subject to change without notice.
6½ Digital Multimeter
Model 12061
Video &
Color
SPECIFICATIONS
Range
Range
Resolution
10nA
100nA
1µA
10µA
Resolution
0.1µV
1.000000V ~
750.000V
1.0µV ~ 1mV
10MΩ
Shunt
Resistance
5.1Ω
0.1Ω
Frequency
(Hz)
3~5
5 ~ 10
10 ~ 20K
20K ~ 50K
50K ~ 100K
100K ~ 300K
3~5
5 ~ 10
10 ~ 20K
20K ~ 50K
50K ~ 100K
100K ~ 300K
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
0.050 + 0.020
0.050 + 0.005
0.100 + 0.010
0.120 + 0.020
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
1.00 + 0.04
0.35 + 0.04
0.06 + 0.04
0.12 + 0.05
0.60 + 0.08
4.00 + 0.50
1.00 + 0.03
0.35 + 0.03
0.06 + 0.03
0.12 + 0.05
0.60 + 0.08
4.00 + 0.50
AC RMS Current
1.000000A
1µA
3.000000A
1.0µA
Frequency
(Hz)
3~5
5 ~ 10
10 ~ 5K
3~5
5 ~ 10
10 ~ 5K
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
1.00 + 0.04
0.30 + 0.04
0.10 + 0.04
1.10 + 0.06
0.35 + 0.06
0.15 + 0.06
Resistance (4W Measurement)
Test Current
100.0000Ω
1.000000kΩ
10.00000kΩ
100.0000kΩ
1.000000MΩ
10.00000MΩ
100.0000MΩ
Diode Test
100µΩ
1mΩ
10mΩ
100mΩ
1Ω
10Ω
100Ω
1mA
1mA
100μA
10μA
5μA
500nA
500nA
Range
Resolution
Test Current
1.00000V
10μV
1mA
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
0.010 + 0.004
0.010 + 0.001
0.010 + 0.001
0.010 + 0.001
0.010 + 0.001
0.040 + 0.001
0.800 + 0.010
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
0.010 + 0.020
All specifications are subject to change without notice.
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
0.1
0.05
0.03
0.01
3~5
5 ~ 10
100mV ~ 750V
10 ~ 40
40 ~ 300K
Measurement Characteristics
NULL, min / max / average, dBm, dB, MX+B,
Math Functions
RATIO, %, limit test (with TTL output)
Measurement
DC CMRR : 140 dB:
Noise Rejection
AC CMRR : 70 dB
60Hz(50Hz)
Integration Time
10 plc/167 ms (200 ms) : 60 dB
& Normal Mode
1 plc/16.7 ms (20 ms) : 60 dB
Rejection NMRR
Input bias current : 25˚C < 30pA
DC Voltage
Input protection : 1000V
DC Current
Input protection: External 3 A 250V fuse
Input impedance: 1 MΩ parallel with 100 pF
AC Voltage
Input protection: 750Vrms all ranges
AC Current
Input protection: External 3 A 250V fuse
Maximum lead resistance (4-wire):
10% of range per lead for 100Ω and 1kΩ ranges.
Resistance
1kΩ per lead on all other ranges.
Input protection: 1000 V all ranges
With audible tone
Continuity/Diode
Continuity threshold: Selectable from1Ω to 1000Ω
RTD: 2-wire, 3-wire and 4-wire measurement
Temperature
Temperature Conversion:
IEC751, Callendar-Van Dusen
External Control
Samples/Trigger
1 ~ 50,000
Trigger Delay
0 ~ 3600 sec.
Memory
2000 readings
Standard
SCPI (IEEE-488.2), Agilent 34401
Complier
Interface
USB, GPIB
General
Power
25VA max.
Consumption
Power
100 V/120 V/220 V/240 V, 45 Hz ~ 440 Hz
Requirements
Dimensions
88.6 x 213.6 x 346.9 mm
(HxWxD)
Operating
0˚C to 50˚C
Temperature
Weight
Approx. 4.36 kgs
Multi-point TC Scanner Card A120004
Maximum
110V rms or 155V peak, 100kHz, 1A switched, 30VA
AC Voltage
(resistive load)
Maximum
110V, 1A switched, 30VA (resistive load)
DC Voltage
Connector Type
Screw terminal, #22 AWG wire size
Common Mode
200V peak btw any terminal and earth
Voltage
Max. Voltage btw
160V peak
Any Two Terminals
K type (-200˚C ~ 1372°) ± 1.5˚C
Thermocouple
(Other type refer to the detailed specifications)
16-8
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
Resolution
Frequency (Hz)
PXI Test &
Measurement
Range
Range
1mA
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
0.010 + 0.030
Semiconductor/
IC
Resolution
1000.00Ω
100mΩ
Frequency and Period
Shunt
Resistance
Electrical
Safety
Range
Resolution
Power
Battery Test &
Passive
Electronics Automation Component
100.0000mV
>10GΩ
Range
Automated
Optical Inspection
10.00000mA
100.0000mA
1.000000A
3.00000A
AC RMS Voltage
0.1µV
1.0 µV
10 µV
100 µV
1mV
Input Resistance
1 year accuracy
±(reading%+range%)
(23˚C±5˚C)
0.0050 + 0.0035
0.0040 + 0.0007
0.0035 + 0.0005
0.0045 + 0.0006
0.0045 + 0.0010
Photovoltaic Test
& Automation
Range
Resolution
Continuity Test
Optical
Devices
100.000mV
1.000000V
10.00000V
100.0000V
1000.000V
DC Current
12061
Flat Panel
LED/
Display Lighting
Model
DC Voltage
Wi-Fi /Bluetooth /LTE Tester
Model ADIVIC MP5000 Series
SPECIFICATIONS
RF Analyzer (Note *1)
Input Frequency Range
MP5000
KEY FEATURES
■ 4-port, parallel, high speed test
■ Supports FDD LTE cellular test standard
■ Supports Wi-Fi 802.11ac, 802.11a/b/g/n
standards
■ Supports Bluetooth V1.x/V2.x/V3.x EDR/V4.x BLE
■ Software Defined Radio(SDR) architecture with
Wideband VSG/VSA in one box
■ Software upgradable for future RF test
standards
■ User friendly GUI for R&D/QA applications
■ API available for production automation
programming
■ Turn-key production automation software
support upon request
RF Port number
IF bandwidth
Max input power
Input power accuracy
@(+20 to -75 dBm)
Phase Noise
LO Leakage (after self-c alibration)
sideband image (IQ-imbalance)
@after self-calibration
Third order input inter-modulation
distortion(IMD3)
Input Return loss
ADC resolution
Sample rate
Initial achievable accuracy
Temperature stability
Aging
Operating Temperature
Operating Voltage
Warm - up time
RF Generator (Note *1)
Output Frequency Range
IF bandwidth
MP5010
KEY FEATURES
■ Wi-Fi, Bluetooth, GPS test capabilities in one box
■ Supports Wi-Fi 802.11ac, 802.11a/b/g/n
standards
■ Supports Bluetooth V1.x/V2.x/V3.x EDR/V4.x BLE
■ Supports GPS 1-8 Channel simulator
■ Optional LTE test package
■ 4-port multi-site parallel test
■ API available for production automation
programming
■ Turn-key production automation software
support upon request
Max Output [email protected] CW
Power [email protected](0 to -95 dBm)
Phase Noise
LO leakage(DC offset)
@after self-calibration
sideband image (IQ-imbalance)
@after self-calibration
Third order inter -modulation
distortion(IMD3)
Return loss
DAC resolution
Sample rate
Initial achievable accuracy
@ 25 ℃, after 60 minutes warm up
Temperature stability @ 0 ℃ ~ 50 ℃
2150~2600 MHz, 4900~6000 MHz
Option : 10 MHz ~ 6 GHz
2 or 4 Ports
120 MHz
+30 dBm peak, +20 dBm average
±0.75 dB (±0.5 dB Typ)
±1.0 [email protected] 0 ℃ ~ 50 ℃
< -100dBc: 1 KHz offset @2.4 GHz
< -9 5dBc: 1 KHz offset @5.8 GHz
<-50 dBc
<-50dBc @ 2.4GHz, -10dBm
<-50dBc @ 5.8GHz, -10dBm
< [email protected] dBm
> 10 dB 2150~2600 MH z
> 12 dB 4900~6000 MH z
16 Bits
160 MS/s
±50 ppb maximum (OCXO)@25 ℃, after 60 minutes
warm up
±20 ppb maximum(OCXO) @0 ℃ ~ 50 ℃
±1 ppb / day maximum (OCXO)
±100 ppb / yr maximum (OCXO)
0 ℃ to 50 ℃
100 V to 240 V
> 30 minute
4900~6000 MHz , 2150~2600 MHz
Option : 10 MHz ~ 6 GHz
120 MHz
+10 dBm @ 2150~2600 MHz
+7 dBm @ 4900 ~ 6000 MHz
±0.75 dB (± 0.5 dB Typ )
±1.0 dB @ 0 ℃ ~ 50 ℃
Phase noise < -100 dBc: 1 KHz offset @ 2.4 GHz
Phase noise < -95 dBc: 1 KHz offset @ 5.8 GHz
< -50 dBc @ 2.4 GHz, -10 dB m
< -50 dBc @ 5.8 GHz, -10 dB m
< -50 dBc @ 2.4 GHz, -10 dB m
< -50 dBc @ 5.8 GHz, -10 dB m
<[email protected](two -13dBm Tone)
> 10 dB 2150 ~ 2600 M Hz
> 12 dB 4900 ~ 6000 M Hz
16 Bits
960 MS/s
± 50 ppb maximum (OCXO)
± 20 ppb maximum (OCXO)
±1 ppb / day maximum (OCXO)
Aging
±100 ppb / yr maximum (OCXO)
Operating Temperature
0 ℃ to 50 ℃
Operating Voltage
100 V to 240 V
Warm-up time
> 30 minute
Note *1 : Test condition Temperature : 15 ℃ ~ 35℃, Voltage : 100 V to 240 V
ORDERING INFORMATION
APPLICATIONS
■ Consumer Mobile
■ Tablet
■ IoT (i.e. Automotive)
16-9
ADIVIC MP5000 : Wi-Fi /Bluetooth /LTE Tester
ADIVIC MP5010 : Wi-Fi /Bluetooth / GPS Mobile
Connectivity Tester
R&D, QA applications
All specifications are subject to change without notice.
RF ATE Test Equipment
Model ADIVIC MP5800
Video &
Color
VSA/VSG RF SPECIFICATIONS
Flat Panel
LED/
Display Lighting
MP5800
Optical
Devices
Photovoltaic Test
& Automation
KEY FEATURES
■ Software Defined Radio(SDR) architecture with
VSG/VSA in one Box
■ RF port support Bi-Directional & TX broadcast
function
■ Support Wi-Fi/BT/GPS standard & general
purpose modulation
■ Build-in arbitrary waveform generator &
debug tools
■ Support calibration box for auto cable loss test
& power meter function
■ User friendly GUI for R&D/QA applications
■ API for production automation programming
■ Integrated Chroma 3380/3650 to build full RF/
Digital ATE turnkey solution
Automated
Optical Inspection
Power
Battery Test &
Passive
Electronics Automation Component
The MP5800 deploys state-of-the-art Software
Designed Radio (SDR) architecture that consists
of full extendibility to all current and future Wi-Fi /
Bluetooth standards. By upgrading firmware and
hardware, it will be capable to support LTE and
other wireless standards in the future.
RF SOC (RF + Digital) Integrated ATE Test
Electrical
Safety
The MP5800 contains high quality VSA (Vector
Signal Analyzer) & VSG (Vector Signal Generator)
to provide a complete and versatile test
environment. A highly integrated GUI is both
intuitive and user-friendly which can run simple
test of Wi-Fi/Bluetooth signal within few clicks &
full test items.
Semiconductor/
IC
The MP5800 comes fully programmed test
waveforms for Wi-Fi 802.11a/b/g/n/ac & Bluetooth
V.1.x/2.x/3.xEDR/4.x BLE which allows immediate
testing for DUTs. Moreover, a built-in waveform
generator utility lets users being able to create
a r b i t r a r y Wi-Fi/B l u e t o o t h t e s t i n g s i g n a l s.
Automatic mass production turnkey software is
also available upon request.
PXI Test &
Measurement
The MP5800 suppor ts up to 8 channel GPS
simulator and allows users create arbitrar y
GPS location signal. Furthermore, it provides
adjustable output power level for each satellite.
Calibration Box for Auto Cable loss Function
ORDERING INFORMATION
ADIVIC MP5800 : RF ATE Test Equipment
All specifications are subject to change without notice.
16-10
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
The MP5800 has integrated Chroma 3380/3650 to
provide complete RF/Digital ATE turnkey solution.
The RF port of MP5800 supports TX broadcast
function is being able to reduce massive time on
testing. The calibration box has auto cable loss
function to increase the accuracy of testing and
simplify the operation.
Multi-Channel GPS Simulator
Model ADIVIC MP6220
SPECIFICATIONS
Model
Frequency Characteristics
Frequency Range
Warm-up time (typical)
Frequency Accuracy
Temperature stability
MP6220
KEY FEATURES
■ Capable of position fix tests for 8 satellites
■ Single channel mode selectable
■ Multi-channel GPS simulator for GPS receiver
position fix test
■ Individual channel is power adjustable
■ Single channel mode for receiver S/N ratio test
■ Tunable power output level from -160dBm to
-55dBm
ADIVIC MP6220
1575.42 MHz
30 minutes
±100 ppb maximum
±100 ppb maximum
±100ppb maximum ;
±1 ppb maximum (Per day)
Aging (Per year)
Channels
Number
Navigation data
Modulation
RF Output Characteristics
High power normal output level
Low power normal output level
Individual Channel Attenuation setting range
Doppler Shift
1 CH, 8 CH
GPS C/A @ 1.023 MHz with 50 bps
BPSK
-55 dBm to -90 dBm
-90 dBm to -160 dBm
-31.5 dB to 0 dB
±30 KHz (1 CH option)
ORDERING INFORMATION
ADIVIC MP6220 : Multi-Channel GPS Simulator
16-11
All specifications are subject to change without notice.
Single channel GPS/GLONASS Simulator Model ADIVIC MP6230C
Video &
Color
Output Center Frequency
Weight
Dimensions
Operating Temperature
Operating Humidity
BPSK
Less than 5X10-10 per day
Less than 5X10-9 -20 to +70˚C
GPS Signal Module : 1.023 MHz (1023 bit gold code), optional
GLONASS Signal Module : 0.511MHz (3135.029354 cycles/chip), optional
GPS Signal Module : SV1~SV32, optional
GLONASS Signal Module : SV1~SV24, optional
50BPS
N-Type female RF out & Cal. out
LCD keypad RS-232
AC Input Voltage: 90V to 265V, 47 to 63 Hz
Input line Current: 0.2A Max.
Max. Output Rating: 250W
5.5 Kg
318mm (W) x 320mm (D) x 100mm (H)
0 to 45˚C
20 to 90%
Electrical
Safety
ADIVIC MP6230 with its high accuracy (resolution
within 0.1dB) output power, built-in highly
stable 10.22MHz OCXO (GLONASS) and 10.23
MHz OCXO (GPS) provides the best signal quality
for the testing requirements of R&D, QA and
Manufacturing line.
Power
Battery Test &
Passive
Electronics Automation Component
Power supply
0.1 rad [email protected] to 10KHz
Automated
Optical Inspection
Channels
Navigation Data
RF Output Connectors
Other signals available
General
Less than -30dBc
Photovoltaic Test
& Automation
APPLICATIONS
■ Evaluation of GPS products quality / accuracy
■ Evaluation of GPS receiver sensitivity
■ Mobile phone GPS function test
■ Performance evaluation of receiver and
module design
■ Verify operational integrity of GPS receivers
and module
C/A Code
GPS Signal Module : 1575.42MHz (L1 band), optional
GLONASS Signal Module : 1598.0625MHz-1605.375MHz (L1 band), optional
-85 to -145dBm
-25 to -85dBm
0.1dB
±1dB
50Ω
Optical
Devices
KEY FEATURES
■ Selectable GPS/GLONASS Satellite Vehicle and
Navigation Data
■ Adjustable RF levels from -85dBm to -145dBm
in 0.1dB steps
■ Provides calibration output level from -25dBm
to -85dBm
■ Embedded OCXO for accurate clock
■ Embedded Doppler function
■ Industry-leading stability, quality and reliability
■ Verifies operational integrity of GPS/GLONASS
receivers quickly
■ Small form factor, easy to operate
RF output level
Calibration RF output level
Resolution
Power Accuracy
RF Output impedance
Spurious
(in GPS/GLONASS band)
Carrier phase noise
Baseband Signal
Modulation method
Oven crystal oscillator
frequency accuracy
OCXO Stability
ADIVIC MP6230C
Flat Panel
LED/
Display Lighting
SPECIFICATIONS
Model
RF Signal
RF Carrier
GPS Monitor
Semiconductor/
IC
ADIVIC MP6230 incorporates an easy to use frontpanel operation with all of the advantages of
traditional instruments without the need for an
external PC.
C/N Testing
ORDERING INFORMATION
All specifications are subject to change without notice.
A490030/A490032
A490033
16-12
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
A490031
PXI Test &
Measurement
ADIVIC MP6230C : Single channel GPS/GLONASS Simulator
Additional Options and Accessories
A490030 : GPS Flat Antenna
A490031 : RF Coaxial Cable
A490032 : GPS / GLONASS Dual Mode Flat Antenna
A490033 : 50 ohm Terminator (N Type)
A490034 : GPS Signal Module
A490035 : GLONASS Signal Module
RF Recorder / Player
MP7600
Test your product with the Real-World signals
■ Eventually your Receiver has to receive the
real-world signal, yet...
■ None of the existing signal generators can
100% emulate the real world signals,
■ Only the RF recorder/player can bring back
repeatable real world RF signals to your lab
Model ADIVIC MP7 Series
KEY FEATURES - MP7600
■ Ultra-high frequency coverage from
300 KHz to 6.0 GHz
■ Pre-trigger function to keep your valuable
record data even before the trigger event
■ 100MHz super wide bandwidth capable of
simultaneously record/playback of 16 NTSC
TV channels
■ MP7600 can have a maximum of 7 sets,
synchronized in parallel, RF record/playback
■ 16-bit high resolution of the ADC/DAC
■ Smart AGC to extend usable dynamic range to
greater than 150dB
■ High linearity to accommodate strong & weak
signals
■ Additional traces for maximum/minimum holds
■ 20+ markers for easy signal identification
■ Baseband IQ data formats compatible to
MATLAB
■ Software utility support including I/Q data
extractor and file segmentation
■ 2.5 inches SSD x4 internal drive bays (4 X 480 GB
by default, 1 TB x4 upgradable
■ 1PPS, IRIG-B support (Optional)
KEY FEATURES - MP7200
■ Adjustable bandwidth from 1 MHz to 25MHz,
capable of recording and playback of the entire
FM stereo broadcasting band 88MHz~108MHz
■ Frequency coverage from 25 MHz to 2.7 GHz
■ RF connector with programmable DC output to
power the external active antenna
■ 100 MS/s sampling rate for recording and
playback path respectively
■ Supports GPS NMEA data recording for route
playback on Google Maps
■ Remote control available
■ Baseband IQ Data formats compatible to
MATLAB
■ Software utility support including I/Q data
extractor and File segmentation
KEY FEATURES - MP7300
■ Dual Channel for Antenna Diversity signal
record/playback, used for car DTV receiver test
■ Adjustable bandwidth from 1 MHz to 45 MHz
■ Frequency coverage from 300 KHz to 3.0 GHz
■ Programmable DC output for the external
active antenna
■ 250 MS/s sampling rate in recording and
playback
■ 16-bit resolution for Rx and 14-bit resolution
for Tx
■ High linearity to accommodate strong & weak
signals
■ Supports GPS NMEA data recording for route
playback on Google Maps, along with RF
playback
■ Remote control available
■ Pre-trigger recording function
■ Data formats compatible to MATLAB analyzer
■ Software utility support including I/Q data
extractor and File segment
SPECIFICATIONS
Sample Rate
Resolution RX/TX
Recorder Channel
Playback Channel
ADIVIC MP7200
RF Recorder/Player
Capacity
25MHz~2.7GHz
25MHz
(20MHz Guaranty BW)
100MS/s
14/14 bit
1
1
Diversity function
No
Trigger function
10MHz Clock
In/Out
SWAP Hard Disk
SSD
Power
Size
Weight
Yes
250MS/s
16/14 bit
1/2
1/2
Yes
(Diversity option)
Yes
No
Yes
Yes
Yes
Standard
AC 100~250V
L : 36 x W : 34 x H : 22.9 cm
14.3 kg
Yes
Standard
AC 100~250V
L : 45 x W : 44 x H : 26.4 cm
depends on configuration
Yes
Standard
12V
35.6 x 30.2 x 10.2 cm
9 kg
Model
TFT Touch Screen
Frequency
Bandwidth
When will you need a RF recorder?
■ Your DTV/DAB/GPS receiver chip can't decode
properly in certain location
■ Your receiver works fine in some locations,
however doesn't in some other locations.
■ Virtual signal source, can be any signal
generator
ADIVIC MP7300
RF Recorder/Player
Capacity
300KHz~3.0GHz
ADIVIC MP7600
RF Recorder/Player
-300KHz~6GHz
45MHz
100MHz
250MS/s
16 bit
1
1
No
Yes
ORDERING INFORMATION
ADIVIC MP7200 : RF Recorder/Player 25MHz~2.7GHz
ADIVIC MP7300 : RF Recorder/Player 25MHz~3.0GHz
ADIVIC MP7600 : RF Recorder/Player 300KHz~6.0GHz
MP7200
16-13
MP7300
All specifications are subject to change without notice.
Wireless Communication Test System
Model ADIVIC MP9000
Photovoltaic Test
& Automation
Automated
Optical Inspection
Operation
An easy-to use GUI and an integrated 10.2" Touch
panel fully conform with one of its designations
to provide an user-friendly environment which
allows the users to easily control the MP9000
functionalities. Speaking of compatibility, the
USB and Ethernet ports are implemented to allow
the users to easily integrate the MP9000 into the
production-line ATE for production test purpose
covering the semi-product (PCBA) and end
product test.
Power
Battery Test &
Passive
Electronics Automation Component
Electrical
Safety
SPECIFICATIONS
Model
ADIVIC MP9000
System
Processor
Intel Core 2 Duo Series
Memory
DDRII 667 2GB
System storage
SATAII 320G HDD or above
Power supply
AC 100 to 240V, 50/60Hz
Operating temperature
0 to 50℃
Operating humidity
0% to 95% RH (Non Condensation)
Storage temperature
-20 to +80℃
Dimensions
360(L) x 340(W) x 200(H) mm
Weight
Approx.17Kgw
OS system
Windows XP Professional User interface
10.2 inch TFT color LCD
Touch Screen
External Interface
USB 2.0 Port x 4
eSATA x 1
Ethernet LAN Port (10BASE-T / 100BASE-TX / 1000BASE-T) x 1
Semiconductor/
IC
PXI Test &
Measurement
ORDERING INFORMATION
16-14
General
Intelligent
Turnkey Test &
Purpose Manufacturing System Automation
ADIVIC MP9000 : Wireless Communication Test System
All specifications are subject to change without notice.
Optical
Devices
APPLICATIONS
Multi-Standards RF Communication Testing
■ GPS
- 6CH, 8CH GPS Model
- RF Level -55dBm to -160 dBm
- Global City Library
- Location editor
- Almanac upgradeable
- 1 Channel GPS Model
- RF Level -55dBm to -160dBm
- Almanac data
- Doppler Control ±30KHz
■ RF Player
- Perfect solution for DTV, GPS, Radio and many
RF communications
- Field testing signal source
- Performance testing signal source
- Supports Frequency ranged from 300K-2.7GHz
- Adjustable bandwidth 25MHz
■ DTV
- DVB-T/H
- ATSC
- DTMB
- ISDB-T
- RF level +10dBm to -110dBm
- Noise Generator
■ FM RDS
- FM 76 to 108MHz
- RF level -10 to -120dBm
- FM Mono
- FM Stereo
- RDS
- RBDS
- RDS TMC / RBDS TMC
- RDS Feature - Alternative Frequency / Enhance
Other Network / Radio Text Plus
■ Audio Analyzer
- RX : AC Level, Noise, Distortion, S/N, Frequency
response, Total Harmonic Distortion THD+N,
SINAD
- TX : CW mode, Multi Tone, 20Hz-20KHz
Sweepmode
Flat Panel
LED/
Display Lighting
MP9000
The MP9000 allows the users to implement single
or multiple standards testing, such as concurrent
paral-lel testing and sequence-based testing.
MP9000 is sophisticated for R&D applications,
and the user friendly GUI also makes it ideal for
production line applications. By bringing in the
concept of one does all, MP9000 would greatly
benefit the customers with dramatic time saving
and high-level of cost-effectiveness.
RF Player Option
ADIVIC RF PLAYER is an exquisite RF- engineering
tool for both field testing and performance testing.
It has the capability of replacing many expensive
instruments from one RF communication to
another. It is by far the only instrument which
crosses over RF communication standards from
the past, the present and the future. RF PLAYER
is meant for all existing RF communications,
for all modulation schemes, for analogue and
digital.MP9000 plays the streams recorded from
the ADIVIC's RF Recorders.
Video &
Color
Introduction
ADIVIC proudly introduces the new model MP9000 RF Station. MP9000 provides a platform
that adopts different wireless communication
modules into variety of combinations for different
purposes & standard require-ments of tests
including GPS, FM RDS/TMC, DTV, Audio Analyzer
and all one way communication standard.
Intelligent Manufacturing System (IMS) Solution
Manufacturing Execution System (MES)
Hemodialysis Management System (HDMS)
Fast Easy Player
17-1
17-3
17-4
Overview
Manufacturing Execution System
Hemodialysis Management System
Fast Easy Player
Manufacturing Execution System
Industry 4.0
KEY FEATURES
■ Complete Production Process
(Traceability)
■ Full Production Information Monitoring
(WIP Control)
■ Equipment /PLC Automatic Connectivity
- Computer Integrated Manufacturing : CIM
- Equipment Automation Program: EAP
■ Expert Quality Control System
- Statistical Process Control : SPC
- Corrective Action Report : CAR
- Out of Control Action Plan : OCAP
■ Manufacturing Equipment Management
- Equipment Management System : EMS
- Overall Equipment Effectiveness : OEE
■ Real-Time Report
- Yield Rate Report
- WIP Report
■ Mobile App Real-Time Queries and
Notifications, supported types :
- Smartwatch
- Smartphone
- Tablet Computer
The New Generation of MES
- The Core System of Automated Factories
An Intelligent Manufacturing System (IMS) is the
key for the integration of automation. As modern
factories trend toward automated production,
traditional IMS (which focuses on only collecting
data and repor t analysis) cannot meet the
emerging requirements of the automation era.
A new generation of IMS is the core system of
automated factories that not only retains the
traditional scope but also covers the functions of
CIM, EAP, equipment connectively, and integrating
robotics. As a comprehensive tool, IMS now meets
the objectives of factory automation by real
time control, data acquisition and data analysis
to improve product quality while reducing
production cost through maximizing the benefits
of enterprise.
Model Sajet MES Series
Sajet MES - The Best Choice of Smart Factory System
Chroma not only specializes in IMS Systems but is also a world-class test, measurement and automated
production line equipment manufacturer, has abundant technology and experiences in IMS and
automated equipment integration that can provide you the best next generation manufacturing
execution system solution..
Complete Production Process Trace Traceability
T h e m a n u f a c t u r i n g p r o c e s s i n fo r m a t i o n
contained in Chroma IMS can assist the factory
to process work orders, monitor workstations,
track and manage inventory as well as to conduct
quality inspection and exception conditions
management. The detail provided allows users
to find lot number, delivery date and quantity
of passive components used in a product from
the supplier. It can also use the lot number to
trace back the shipped products for locations
and quantities to reduce the loss caused by
defect components. The traceability features can
rapidly highlight material or process problems, a
necessary tool for factory management.
Full Production Information Monitoring-WIP Control
The IMS provides flexible routing management that
allows users to plan different routes based on the
products, control the quantity of yield and defective
goods, manage reworked products and calculate the
pass-through rate. The complete traceability data
collection and production line information is fully
controlled by Chroma IMS to increase the production
efficiency and reduce production costs.
Flexible Routing Management - LOT Control
Chroma IMS also provides the function of flexible
r o u t i n g c o n t r o l. U s e r s c a n d o d i f f e r e n t r o u t e
management per different products, at the same time
support different demands of controlling products,
work orders, and lots as the management objectives.
Users can easily structure production types on diverse
operation interfaces from different industries, providing
prediction and abnormality handling system, to control
abnormality efficiently.
17-1
All specifications are subject to change without notice.
Manufacturing Execution System
■ Barcode Printing Device and Sensor Switch
- Long/short range optical switching system
- Various industrial barcode printer
■ Mobile Application Management Device
- PDA, Tablet Computer, smart watch
(iOS/Windows/Android)
- Wireless Scanner, wireless Terminal, etc.
Optical
Devices
■ Other Electromechanics and Factory Devices
- Temperature controller, electronic scale
- PLC, connectable device (Scanner), etc.
■ Display Device Management
- Various production efficiency kanban
- Factory notice kanban, Pick To Ligh, etc.
■ Automatic Equipment
- Automatic labeling machine, laser engraving
machine, etc.
- Fully automatic test equipment solution
Power
Battery Test &
Passive
Electronics Automation Component
Real-time Report
- Yield Rate Report,WIP Report
Chroma IMS has power ful IMS database
technology in the industry that can be online in
real time to administer every work item precisely.
The report generator developed by Chroma is
applicable for complete report query and real
time report generation. Various mobile devices
like smart phone, PDA and Tablets can be used
to quer y the repor t and get an immediate
snapshot of the factory status. It can also be
integrated into BI (Business Intelligence) system so
enterprise managers can view thorough reports of
production line.
■ Industrial Network Peripherals
- Data collector, IPC
- TCP/IP, RS232, USB signal converter, etc.
Automated
Optical Inspection
■ Optical Scanning
- Various handheld 1 & 2 dimension gun type
barcode scanner
- RFID Reader, fixed barcode scanner system
Photovoltaic Test
& Automation
Users can use PCs or display devices to manage
the processing workstation easily.
完整硬體設備整合解決方案,滿足各類需求
■ Integration of Various Devices
- Various test equipment of Chroma
- Manufacturing database online control
program development and implementation
Flat Panel
LED/
Display Lighting
Manufacturing Equipment Management EMS, OEE
Chroma IMS is capable of collecting the
wor kstation status to give the super visor
and on-site personnel the ability to monitor
the workstation status in real time, log its
maintenance status and query the information of
device, including :
- Device failure analysis,
- Device utilization rate,
- Failure frequency analysis,
- Device maintenance time analysis, etc.
Video &
Color
Industrial Automated integration platform,
Equipment Automation Program (EAP) / ATE
Chroma IMS collects production data, reads RFID
to identify product identity and quantity, and
through the OPC connects machine connection
(EAP) including equipment PLC, automatic arm,
automated production lines, automated guided
vehicle and other automation equipment.
Chroma IMS provides an API interface for testing
program integration to meet a variety of data
communication and equipment integration,
including SECS / MQ / RV / OPC and so on.
Model Sajet MES Series
Electrical
Safety
Semiconductor/
IC
List of Systems and Functional Modules
Other Systems
Real-time SPC
Work Hour System
Global RMA System
Computer Numerical Control (CNC)
Warehouse Management System
Material and Pull System (MMPS)
ANDON System
Note : Independent modules
All specifications are subject to change without notice.
Smary Factory Modules
App Report
Computer Integrated Manufacturing,
PLC Handshaking Centre (CIM/PHC)
Equipment Automation Program (EAP)
Equipment Management System (EMS/OEE)
Formation Measurement System (FMS)
Fast Easy Player (FEP)
Recipe Management System (RMS)
Note : Independent modules
Optional Modules
ERP/MES Interface
Automated Test Eqiipment (ATE)
Incoming Quality Control (IQC)
Tooling Manager
Alarm System
SMT Feeding System
Shipping
Material Warehouse
Return Merchandise Authorization (RMA)
e-Kanban (Real-time Display Board)
Note : Subsidiaries of basic modules
17-2
General
Intelligent
Turnkey Test
Purpose Manufacturing System & Automation
Basic Modules
Data Center
Work Order Manager
Barcode Center
TGS Server (Data Collection)
Repair
Rework
Quality Control
Packing
Run Card Manager (R/C)
WIP IN/OUT Tracking
Report
PXI Test &
Measurement
ORDERING INFORMATION
Hemodialysis Management System
KEY FEATURES
■ Digital Sickbed Arrangement Management
■ e-Hemodialysis Record
■ Accurate Weight Scale Management
■ HOPE Auto-Uploading Management
■ Digitalize Medical Records Management
■ HD Visualized Data Analysis
Chroma HDMS is Your Best Choice
HemoDialysis Management system integrates
related software and hardware, saving medical
personnels' time on organizing all the paper
work. Also, it helps to decrease the possible error
that might be happened during the process of
hand-writing document. Through the automatic
p r o c e s s o n t h e s y s t e m, w e c a n g e t m o r e
completed data, at the same time, enhancing
medical and nursing data integration.
HD Visualized Data Analysis
The system can also produce short, medium, and
long term related hemodialysis data and reports,
so as to be the analysis of medical and nursing
research, providing a basis to improve medical
quality.
Model Sajet HDMS Series
Digital Sickbed Arrangement Management
Through digital sickbed arrangement, it's easier
to manage all the sickbed arrangement. The user
interface is clear and useful for the administrator to
control the entire situation, without spending lots
of time on complicated paper work.
Digitalize Medical Records Management
Digital medical records gradually replace the
traditional paper medical records, including
eyesight, hearing, and past medical history. It
becomes more convenient to inquire patients'
medical records.
e-Hemodialysis Record
All the data on dialysis machine will be
automatically uploaded to the Chroma AP Server.
The system will automatically help to fill in related
reports. Not only nursing staffs can save lots of
time doing complicated hand-writing document
but also keep the complete data for the future
references and inquiry.
Lists of Systems and Functional Modules
Basic Modules
■ Data Center
■ Medical Records
■ Dialysis Machine
■ HemoDialysis
■ Sickbed Arrangement
■ Report
Accurate Weight Scale Management
In order to decrease inconvenience and possible
error of hand-writing process, the number of
weight scale can be automatically uploaded to the
system, which reaches the goal of "PAPERLESS".
Optional Modules
■ Weight Scale
■ HOPE Uploading
■ HIS Connection
■ Doctor Patrol
■ Peritoneal Dialysis
■ NIS Connection
■ PACS Management
HOPE Auto-Uploading Management
So as to reduce repeatedly key-in data, users can
conduct the doctors' orders and upload it to HOPE
on HDMS. Any computers that connect to the
hospital local area network can inquire the medical
records and conduct doctors' orders through the
authorized permission.
17-3
Complete Hardware Integrated Solution
Satisfies Various Needs
■ HemoDialysis Device
■ Dialysis Machine Connection NPort
■ Various Handheld 1&2 Dimension Gun-Type
Barcode Scanner
■ Mobile Application Management Device:
PDA, Tablet Computer, and etc.
All specifications are subject to change without notice.
Fast Easy Player
Model FEP Series
Flat Panel
LED/
Display Lighting
Picture Files Maintenance
■ User can easily upload pictures by dragging
■ Create a group upon existed folders
■ Support different formats of pictures
■ Set pictures display order and time interval
Video &
Color
User Interface
■ With function of display of dashboard, scrolling
text, bulletin board, pictures rotator, date, time,
weather, embedded web page and etc
■ Voluntarily adjust the layout according to
actual needs
■ Multiple templates can be set at the same time,
and display on different monitors
Optical
Devices
Photovoltaic Test
& Automation
System Architecture- Establish eKanban through Wi-Fi
The new generation of Chroma eKanban solution integrates HDMI interface and different kinds of
digital display monitors under Android platform. It helps to deliver real-time information to display
monitors through Wi-Fi in factories. Moreover, it is easy to set up the layout configuration on Web
interface so as to upload and broadcast real-time kanban information to factories, hospitals, retail
stores, and public environments, providing the best choice of visual management solution.
Power
Battery Test &
Passive
Electronics Automation Component
APPLICATIONS
■ Real-time information broadcast
through Wi-Fi in hospitals, retail stores,
and public environments
■ Real-time broadcast of factory
production efficiency kanban
through Wi-Fi
■ Real-time broadcast of factory eSOP
through Wi-Fi
■ Real-time broadcast of above messages
on mobiles and tablets through Wi-Fi
Electrical
Safety
17-4
General
Intelligent
Turnkey Test
Purpose Manufacturing System & Automation
All specifications are subject to change without notice.
PXI Test &
Measurement
Factory Layout- One platform can manage all the kanbans
Chroma FEP can establish new kanban according to different area configurations, setting up template
through one single managing platform. Each functional module can be configured by dragging. The
configurable functions include picture files, weather information, clock, scrolling text, dashboard, chart
and diagram, bulletin board, table, and embedded web page, providing managers integrated kanban
information.
Semiconductor/
IC
Setting Up & Installment
■ Connect the display devices through HDMI
■ Internal Android platform on AP
■ Fast hardware setup
■ Setup can be finished under environment
with Wi-Fi Connect to SQL server easily
Automated
Optical Inspection
KEY FEATURES
■ Broadcast through Wi-Fi
■ Log in on web browser
■ Modularize interface setting /
Flexibly adjust layout
■ Integrate multiple ways to
connect external database
■ Voluntarily define the chart and
diagram
■ Platform controls the area and
setting of each screen
Turnkey Test & Automation Solution
Assembly & Test Automation Solutions
Smart Conveyor
18-1
18-2
Selection Guide
Assembly & Test Automation
Applications
Page
Flat Panel Display Burn-in & Testing
LCM, LCD & other flat panel displays
5-13
LED Lighting Automatic Assembly & Testing
LED light bulbs & tubes
6-9
Photovoltaic Automatic Testing & Sorting
Solar wafers & cells
8-3
Battery Cell Formation & Assembly
Lithium Ion & lithium polymer secondary batteries
11-1
Passive Component Test & Packing
Inductors
12-25
IC Automatic Testing & Sorting
especially for CIS Testing (CMOS Image Sensor), capable of
handling devices of a large variety of package types
including QFP, TQFP, BGA, PGA, etc.
14-16
Smart Conveyor
Manufacturing transportation
18-2
Overview
Assembly & Test Automation Solutions
APPLICATIONS
■ Flat Panel Display Burn-in & Testing
■ LED Lighting Automatic Assembly & Testing
■ Photovoltaic Automatic Testing & Sorting
■ Battery Cell Formation & Assembly
■ Passive Component Testing & Packing
■ IC Automatic Testing & Sorting
■ 3C Device Automatic Assembly
Chroma is a world leading supplier of precision
Test and Measurement instrumentation.
ORDERING INFORMATION
* Call for customized availability
Utilizing in-house automated handling and
m an u f a c t u r i n g exe c u t i o n s ys te m (M E S)
expertise, Chroma specializes in integrated
and fully automated turn-key electronic test
and manufacturing solutions for technologies
including FPD (Flat Panel Display), video and color,
LED/lighting, photovoltaic, Li-battery, passive
components, semiconductor/IC, etc.
Inquire Now !
18-1
All specifications are subject to change without notice.
Smart Conveyor
Model 5703
Video &
Color
Flat Panel
LED/
Display Lighting
Optical
Devices
Photovoltaic Test
& Automation
ORDERING INFORMATION
5703 : Smart Conveyor
* Call for customized availability
Power
Battery Test &
Passive
Electronics Automation Component
To fulfill the need of complete test solutions from
the market, Chroma not only provides test and
measurement instruments, but also integrates
with automated systems and manufacturing
execution systems as turnkey solutions, which
bring more value and service to customers and
help customers in terms of time saving, cost
saving, and one-stop full service.
Automated
Optical Inspection
KEY FEATURES
■ Modular architecture
■ Hybrid Operating mode
■ Reconfigurable line layout
■ Intelligent lifter
■ High speed pick and place
■ Autonomous material routing
Inquire Now !
Electrical
Safety
Semiconductor/
IC
Lift up and lift down
Sorting
18-2
General
Intelligent
Turnkey Test
Purpose Manufacturing System & Automation
All specifications are subject to change without notice.
Pick and place
PXI Test &
Measurement
Barcode binding
Customer Support & Service
WARRANTY SERVICE
C H R O M A AT E I N C . w a r r a n t s i t s
i n s t r u m e n t s a g a i n s t a l l d e fe c t s i n
wor k manship and mater ial. I f you
should experience a problem with your
instrument, our technicians are available
to help you over the phone, or find the
nearest service support for timely repair.
CALIBRATION AND REPAIR SERVICE
Whatever your test and measurement
hardware support needs, Chroma can
provide a reliable, cost-effective support
selection that you can trust to reduce
downtime and get you back to Business
swiftly.
Radiation Test
Chroma offers total solutions in selling
the highest quality instrumentation
Conduction Test
available and service. That begins
with the first call to Chroma and
c o n t i n u e s a f t e r t h e s a l e t h ro u g h
long-term product support. Our sales
and service personnel work closely to
help you make the best selections for
your applications. Then we help you
maximize your investment by ensuring
optimum equipment performance.
All this is accomplished through
customer support programs ranging
from training to product installations
and a variety of maintenance plans.
HALT & HASS System
• Instrument Calibration
Keep your equipment operating with
maximum precision: Chroma's calibration
services are all traceable to national and
international standards.
ESD Test
- On-site Calibration for All Major
Instrument Brands
- Service Center Instrument Calibration
• Instrument Repair
Chroma offers a var iet y of flexible
choices to maximize instrument uptime,
with just the coverage you need for
repair.
Optical Laboratory
- Instrument Repair Agreements
- Instrument Standard Repair
• Test System Calibration and Repair
Maximize test system uptime. Chroma
has flexible, custom-configurable service
and support package, available on select
solutions for your specific needs.
- On-site System Calibration
- On-site System Repair
19-1
Programmable Temperature &
Humidity Chamber
For detail customer support services, please visit our website at www.chromaate.com
• Service Warranty
Chroma's ser vice is unconditionally
w a r r a n t e d f o r 90 d a y s, e x c e p t f o r
disposables such as batteries and lamps,
abuse and damage. All calibrations are
traceable to National Standards like
CNLA.
CUSTOMER-SITE INSTALLATIONS
Chroma provides on-site installations
for most Chroma-configured systems.
Your Chroma service person will set
up your product to meet all operating
specifications. Contact your local sales
and service office or sales agency for
more information.
TECHNICAL SUPPORT
Chroma provides high quality technical
suppor t on applications, operation,
measurement specification, hardware,
and software, by expert Application
e n g i n e e r s. Co n t a c t u s fo r m o re
information.
Chroma Service Center - Germany
LONG TERM PRODUCT SUPPORT
Chroma supports its instruments for a
period of five to ten years beyond the
end of production (depending upon
the instrument), and wherever possible,
w e m a k e a n e f fo r t t o s u p p o r t o u r
instruments for much longer time.
PRODUCT UPGRADE
Older instruments may be upgraded in
order to extend the life of the product on
your bench or in your system. Upgrades
include adding options or new functions,
and/or updating firmware.
REPLACEMENT PARTS
Reduce your inventory and free up your
technical staff by taking advantage of
our repair exchange modules and board
assemblies. Simply call or FAX in your
purchase order and Chroma will send you
a replacement part.
CUSTOMIZED SERVICES
In addition to Taiwan headquarters, we
not only distribute oversea branch offices
but also supply customized serviecs
to meet various customs and cultures.
In Europe, our customers can inspect
instruments' demonstrations easily on
the CBC (Chroma Business Coach) which
works as a dynamic show-room instead
of taking long Business trips. If you are
interested in this service, please contact
our Europe branch office directly.
Chroma Service Center - Dongguan, China
China Online Service
on WeChat media
TRAINING
Chroma provides formal training courses
to help you get up to speed and make the
most of our products.
For detail customer support services, please visit our website at www.chromaate.com
19-2
Global Service Network
HEADQUARTERS
Chroma ATE Inc.
66 Huaya 1st Road, Guishan,
Taoyuan 33383, Taiwan
Tel: +886-3-327-9999
Fax: +886-3-327-8898
E-mail: [email protected]
www.chromaate.com
HSINCHU
Chroma ATE Inc.
Hsinchu Branch Office
6F, No. 5, Technology Rd.,
Science Park, Hsinchu City
30078, Taiwan
Tel: +886-3-563-5788
Fax: +886-3-563-5758
KAOHSIUNG
Chroma ATE Inc.
Kaohsiung Branch Office
No.1, Beineihuan E. Rd.,
Nanzi Dist., Kaohsiung City
81170, Taiwan
Tel:+886-7-365-6188
Fax:+886-7-364-9500
OVERSEAS BRANCH OFFICES
U.S.A.
Chroma ATE, Inc. (U.S.A.)
7 Chrysler, Irvine, CA 92618
Tel: +1-949-421-0355
Fax: +1-949-421-0353
Toll Free: +1-800-478-2026
E-mail: [email protected]
www.chromaus.com
Chroma ATE Germany
Südtiroler Str. 9, 86165
Augsburg, Germany
Tel: +49-821-790967-0
Fax: +49-821-790967-600
E-mail: [email protected]
www.chromaeu.com
SUZHOU
Chroma ATE (Suzhou) Co., Ltd.
Building 7, Shi Shan Industrial Gallery,
No. 855, Zhu Jiang Rd., Suzhou
New District, Jiang Su, China
Tel: +86-512-6824-5425
Fax: +86-512-6824-0732
E-mail: [email protected]
JAPAN 日本
Chroma Japan Corp.
888 Nippa-cho, Kouhoku-ku,
Yokohama-shi, Kanagawa,
223-0057 Japan
Tel: +81-45-542-1118
www.chroma.com.cn
Fax: +81-45-542-1080
E-mail: [email protected]
www.chroma.co.jp
SOUTHEAST ASIA
Quantel Pte Ltd.
(A Company of Chroma Group)
46 Lorong 17 Geylang # 05-02 Enterprise
Industrial Building, Singapore 388568
Tel: +65-6745-3200
Fax: +65-6745-9764
E-mail: [email protected]
www.quantel-global.com
HONG KONG
Neworld Electronics Ltd.
Unit 6, 6F, Shui Hing Centre, No. 13,
Sheung Yuet Rd., Kowloon Bay,
Kowloon, Hong Kong
Tel: +852-2331-9350
Fax: +852-2331-9406
E-mail: [email protected]
Chroma System Technology
(Suzhou) Co., Ltd.
503-1, 4th Floor Genway LOHASTOWN,
88 Building, 999 Xinghu Road,
SIP Suzhou
Tel: +86-512-6807-1889
Fax: +86-512-6807-1886
E-mail: [email protected]
www.chroma.com.cn
CHONGQING
Chroma Electronics (Shenzhen) Co., Ltd.
Chongqing Branch Office
Building 4 Longfor MOCO, No. 13-8,
No.166, XinNan Rd, YuBei District,
Chongqing, China
Tel: +86-23-6703-4924 / 6764-4839
Fax: +86-23-6311-5376
E-mail: [email protected]
www.chroma.com.cn
XIAMEN
Chroma ATE (Suzhou) Co., Ltd.
Xiamen Branch Office
Unit 705-706, No.55 Building B,
Wanghai Road, Software Park,
Xiamen, Fujian, China
Tel: +86-592-8262-055
CHINA
Fax: +86-592-5182-152
BEIJING
Chroma Systems Solutions, Inc. Chroma Electronics (Shenzhen) Co., Ltd. E-mail: [email protected]
www.chroma.com.cn
19772 Pauling, Foothill Ranch,
Beijing Branch Office
CA 92610
8F, Building 7, No.18 Feng Chuang
Tel: +1-949-600-6400
Technology Park, 13th Ke Chuang Street, SHENZHEN
Fax: +1-949-600-6401
Economic Technological Development
Chroma Electronics (Shenzhen) Co., Ltd.
E-mail: [email protected]
Area, Yizhuang, Beijing, China
8F, No.4, Nanyou Tian An Industrial Estate,
Shenzhen, China
www.chromausa.com
Tel: +86-10-5764-9600, 5764-9601
Tel: +86-755-2664-4598
Fax: +86-10-5764-9609
Fax: +86-755-2641-9620
E-mail: [email protected]
EUROPE
E-mail: [email protected]
www.chroma.com.cn
Chroma ATE Europe B.V.
Morsestraat 32, 6716 AH Ede,
www.chroma.com.cn
The Netherlands
SHANGHAI
Tel: +31-318-648282
Chroma Electronics (Shanghai) Co., Ltd. DONGGUAN
Fax: +31-318-648288
3F Building 40, No. 333, Qin Jiang Rd.,
Chroma Electronics (Shenzhen) Co., Ltd.
E-mail: [email protected]
Shanghai, China
Dongguan Branch Office
www.chromaeu.com
Tel: +86-21-6495-9900
3F,Building YD3-4, Guancheng
Fax: +86-21-6495-3964
Technology Park,Shi Long Road,
E-mail: [email protected]
Guancheng District, Dongguan City,
www.chroma.com.cn
Guangdong, China
Tel: +86-769-8663-9376
Fax: +86-769-8631-0896
E-mail: [email protected]
20-1
www.chroma.com.cn
DISTRIBUTORS
AUSTRALIA
Power Parameters Pty Ltd.
(Test & Measurement Instruments)
83 Northern Road, Heidelberg West 3081
Victoria, Australia
Tel: +61-3-9450-1500
Fax: +61-3-9457-6327
E-mail: [email protected]
www.parameters.com.au
AUSTRIA
DataTec GmbH
(Test & Measurement Instruments)
Ferdinand-Lassalle-Str. 52 D-72770
Reutlingen, Germany
Tel: +49-7121 / 51 50 50
E-mail: [email protected]
www.datatec.de
Universal Elektronik Import GmbH
(Test & Measurement Instruments)
Anton-Freunschlaggasse
49 AT-1230 Wien, Austria
Tel: +43-1-5451-588
Fax: +43-1-5451-464
E-mail: [email protected]
www.uei-vienna.com
BAHRAIN
Didactic Systems & Technology
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
BALKANS
(Montenegro/Serbia/Croatia/Slovenia)
ALL DATA EE d.o.o.
(Test & Measurement Instruments)
C. Zore Perello Godina 2 SI-6000 Koper
Tel: +386-5-9072606
Fax: +386-5-9072601
E-mail: [email protected]
www.alldataee-doo.com
BELARUS
Profcon
(Test & Measurement Instruments)
Kropotkina Str. 91 A/ 4, Office 3A,
220002 Minsk, Belarus
Tel: +375-17 237 4211
Fax: +375-17 283 1799
E-mail: [email protected]
www.ate-lab.com
The areas and distributors are listed in alphabetical order.
BENELUX
C.N. Rood N.V./S.A.
(Test & Measurement/PXI
Instruments, Semiconductor ATE)
Z.1. Researchpark 40, B-1731 Zellik,
Belgium
Tel: +32-2-467-03-50
Email: [email protected]
TT&MS BV.
(Test & Measurement Instruments)
Frankweg 25, 2153 PD
Nieuw - Vennep, The Netherlands
Tel: +31-252-621080
Fax: +31-252-620702
E-mail: [email protected]
www.ttms.nl
BRAZIL
T&M Instruments Repres. Ltda
(Test & Measurement Instruments)
Rua Princesa Isabel,
DENMARK
Atimco AS
(Test & Measurement Instruments)
BØgekildevej 7B DK-8361
Hasselager, Denmark
Tel: +45-86-258899
Fax: +45-86-255889
E-mail: [email protected]
www.atimco.dk
QUALITYSOURCE Groupe Spherea
(Test & Measurement Instruments)
Parc de I'Envol-2 rue du Marechal de
lattre de Tassigny-78990 elancourt,
France
Tel: +33-130-489-966
Fax: +33-130-432-846
E-mail: [email protected]
www.qualitysource.fr
Nortelco Electronics Danmark
(Test & Measurement Instruments)
Værkstedsgården 14, 1 DK-2620
Albertslund, Denmark
Tel: +45-48 17 75 00
Fax: +45-48 17 75 10
E-mail: [email protected]
www.nortelcoelectronics.dk
GERMANY
CompuMess Elektronik GmbH
(Test & Measurement Instruments)
Lise-Meitner-Strasse 4
D-85716 Unterschleißheim,
Germany
Tel: +49-89 321 50 10
Fax: +49-89 321 50 11
E-mail: [email protected]
www.compumess.de
EGYPT
Technical Solution Engineering Co.
(Test & Measurement Instruments)
57 Hosny Ahmed Khalaf St.,
1750-Brooklin-CEP, 04601-003,
Sao Paulo-SP-Brazil
Tel: +55-11-5092-5229
Fax: +55-11-5044-2414
E-mail: [email protected]
www.tminstruments.com.br
Aprt. 3, Nasr City, Egypt
Tel: +202-670-6599
Fax: +202-670-6183
E-mail: [email protected]
www.tsec.com.eg
BULGARIA
GIGA ELECTRONICS EOOD
(Test & Measurement Instruments)
17, Manastirska Street 1111 Sofia,
Bulgaria
Tel: +359 2971 4919
Fax: +359 2971 4919
E-mail: [email protected]
www.gigatest.net
FINLAND
YE International
(Test & Measurement Instruments)
Luomannotko 6, FIN 02200 Espoo,
Finland
Tel: +35 810 289 1200
Fax: +35 810 289 1270
E-mail: [email protected]
www.yeint.fi
CZECH REPUBLIC
H TEST a.s.
(Test & Measurement Instruments)
Šafránkova 3, 15500 Praha 5.
Czech republic
Tel: +420-2-3536-5207
E-mail: [email protected]
www.htest.cz
Meatest s.r.o
(Test & Measurement Instruments)
Ksirova 118A, CZ-619 00 Brno,
Czech Republic
Tel: +420-5-4325-0886
Fax: +420-5-4325-0890
E-mail: [email protected]
www.meatest.cz
FRANCE
ACQUISYS
(PXI Instruments)
30 av Robert Surcouf 78960
Voisins le Bretonneux, France
Tel: +33-1-3452-4090
Email: [email protected]
MB Electronique
(Test & Measurement Instruments)
106, rue des frères Farman ZI - BP 31
F-78533 Buc Cedex, France
Tel: +33-139-676-767
Fax:+33-139-565-344
E-mail: [email protected]
www.mbelectronique.fr
DataTec GmbH
(Test & Measurement Instruments)
Ferdinand-Lassalle-Str. 52 D-72770
Reutlingen, Germany
Tel: +49-7121 / 51 50 50
E-mail: [email protected]
www.datatec.de
StanTronic Instruments GmbH
(PXI Instruments)
Keuper Weg 6, D-71083
Herrenberg, Germany
Tel: +49-7031-4100-8914
Fax: +49-7031-4100-8918
www.stantronic.de
E-Mail: [email protected]
Schubert Technologies
(Semiconductor ATE & Handler)
Saentisstrasse 43, D-81825 Munich,
Germany
Tel: +49 89-4513-9633
Fax: +49 89-4513-9628
E-mail: [email protected]
www.schubert-technologies.eu
GREECE
NetScope Solutions S.A.
(Test & Measurement Instruments)
4, Lachana St., New Filadelfia 143 42
Athens, Greece
Tel: +30-210-272-4107
Fax: +30-210-271-1999
E-mail: [email protected]
www.netscope.ge
Vector Technologies LTD
(Test & Measurement Instruments)
Diogenous 40 Str. 152 34 Chalandri,
Athens, Greece
Tel: +30-210-6858-008
Fax: +30-210-6858-118
E-mail: [email protected]
www.vectortechnologies.gr
HUNGARY
Eltest Ltd.
(Test & Measurement Instruments)
H-1015 Budapest, Hattyu u. 16,
Hungary
Tel: +36-1-202-1873
Fax: +36-1-225-0031
E-mail: [email protected]
www.eltest.hu
H TEST Hungary Kft.
(Test & Measurement Instruments)
Gyori Nemzetkozi Ipari Park,
Gesztenyefa u. 4, H-9027 Gyor,
Hungary
Tel: +36-96 999 262
E-mail: [email protected]
www.htest.hu
Kora BT.
(Test & Measurement Instruments)
Torokor st. 31 H-1145 Budapest,
Hungary
Tel: +36-1-223-1045
Fax: +36-1-221-2541
E-mail: [email protected]
www.kora.hu
INDIA
Quantel Technologies India Private
Limited (New Delhi)
(Test & Measurement Instruments)
K-13 Ground Floor, Lajpat Nagar-ll,
New Delhi-110024
Tel: +91-11-4132-5052
Fax: +91-22-4015-6221
E-mail: [email protected]
www.quantel-global.com
Quantel Technologies India Private
Limited (Mumbai)
(Test & Measurement Instruments)
Unit No. 3134/3135, D Wing, 3rd Floor,
Oberoi Garden Estate, Off Chandivali
Farms Rd., Chandivali, Andheri(East),
Mumbai-400072
Tel: +91-22-4229-1008/4229-1002
Fax: +91-22-4015-6221
E-mail: [email protected]
www.quantel-global.com
20-2
Global Service Network
Quantel Technologies India Private
Limited (Bangalore)
(Test & Measurement Instruments)
No. 301, #130 Prestige Infantry Court
Infantry Rd., Bangalore-560001
Tel: +91-80-4094-1520/1507
Fax: +91-80-4093-6673
E-mail: [email protected]
www.quantel-global.com
MEL Systems & Services Ltd.
(Head Office)
(Test & Measurement Instruments)
Plot # 173, Developed Plots Estate
for Electrical, Electronic & Instrument
Industries, Perungudi,
Chennai - 600 096, India
Tel: +91-44-2496-1903/04
Fax: +91-44-2496-0488
E-mail: [email protected]
www.melss.com
MELSS Branch Office (Bangalore)
(Test & Measurement Instruments)
203, 2nd Floor, 'MOTA CHAMBERS',
No.9, Millers Road,
Bangalore - 560 052
Tel : +91-8-2226-6546
Fax : +91-8-2226-8205
E-mail: [email protected],
[email protected]
MELSS Branch Office (Mumbai)
(Test & Measurement Instruments)
C/216A, Kailash Industrial Complex,
Behind Godrej Residential Colony,
Park Site,Vikhroli (West),
Mumbai - 400079
Tel: +91-22-2518-0915/16
Telefax: +91-22-2518-0915
E-mail: [email protected],
[email protected]
MELSS Branch Office (New Delhi)
(Test & Measurement Instruments)
C-52. 1st Floor, Shashi Garden
(Opp, Dena Bank) Mayur Vihar
Phase-I, Delhi-110091
Tel: +91-11-2275-8261
Telefax: +91-11-2275-8254/61
E-mail: [email protected],
[email protected]
20-3
INDONESIA
PT Quantel
ITALY
All Data S.r.l.
(Test & Measurement Instruments)
Ruko Easton Blok D No. 10,
Lippo Cikarang, Kelurahan Cibatu,
Kecamatan Cikarang Selatan, Kabupaten
Bekasi, Indonesia
Tel: +62 813 2529 7885
[email protected]
www.quantel-global.com
(Test & Measurement Instruments)
Via Volontari dle Sangue 11
20092 Cinisello Balsamo (MI),
Italy
Tel: +39-0266 0155 66
Fax: +39-0266 0155 77
E-mail: [email protected]
www.alldata.it
IRAN
Arvin Afzar Co.
(Test & Measurement Instruments)
No. 22 Sarmad St., North Sohrevardi Ave.,
Tehran 15539 Iran
Tel: +98-21-8852-9254~5
Fax: +98-21-8874-5984
E-mail: [email protected]
Barletta Apparecchi Scientifici
(Test & Measurement Instruments)
VIA Prestinari 2-20158 Milano,
Italy
Tel: +39-02-3931-2000
Fax: +39-02-3931-1616
E-mail: [email protected]
www.barletta-as.com
Didactic Systems & Technology
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
JAPAN
Combex Co.,Ltd
(Test & Measurement Instruments)
IRAQ
Didactic Systems & Technology
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
IRELAND
MDL Technologies Ltd.
(Test & Measurement Instruments)
Unit 11 Devonshire Business Centre
Works Road Letchworth Herts SG61GJ,
United Kingdom
Tel: +44-146-243-1981
Fax: +44-560-315-2515
E-mail: [email protected]
www.mdltechnologies.co.uk
ISRAEL
Meltronics
(Test & Measurement Instruments)
132 Menachem Begin Road St.
1 Azrieli Center Round Tower,
34th Floor Tel Aviv, Israel
Tel: +972-03-644-4492
Fax: +972-77-345-0470
E-mail: [email protected]
www.meltronics.co.il
5-12,Kiyohara-cho,Ohta-shi,
373-8567 Gunma
Tel: +81-276-37-8521
Fax: +81-276-37-8507
www.combex.co.jp
Hodaka Denshi Co.,Ltd.
(Test & Measurement Instruments)
834-2, Bukko-cho,Hodogaya-ku,
Yokohama 240-0044
Tel: +81-45-331-9302
Fax: +81-45-333-9257
www.hodaka.co.jp
KOKKA ELECTRIC CO., LTD.
(Test & Measurement Instruments)
6-14,Tenman 1-chome,
Kitaku,Osaka, 530-0043
Japan
Tel: +81-6-6353-5551
Fax: +81-6-6354-0173
www.kokka-e.co.jp
Kyoritsu Electric Corporation
(Test & Measurement Instruments)
61-1, Nakadahoncho,Suruga-ku,
Shizuoka-shi, 422-8686 Japan
Tel: +81-54-288-8888
Fax: +81-54-285-1105
www.kdwan.co.jp
MAC SYSTEMS CORPORATION
(Test & Measurement Instruments)
Kusumoto 15 Building 6F,1-7-2, Nishiki,
Naka-ku, Nagoya-shi, 460-0003, Japan
Tel: +81-52-223-2811
Fax: +81-52-223-2810
www.macsystems.co,jp
MEIJI ELECTRIC INDUSTRIES CO, LTD.
(Test & Measurement Instruments)
13-8,Kameshima2-chome,
Nakamura-ku, Nagoya,
453-8580 Japan
Tel: +81-52-451-7661
Fax: +81-52-451-7659
www.meijidenki.co.jp
Miwa Electric Industrial Corporation
(Test & Measurement Instruments)
Shinjuku Seven Bldg, 8-1, Shinjyuku
2-chome, Shinjyuku-ku, 160-0022,
Tokyo
Tel: +81-3-3341-2101
Fax: +81-3-3341-4426
www.miwadenki.co.jp
Nihon Denkei Co., Ltd.
(Test & Measurement Instruments)
Seikoukai kanda Building 5-12,
3-chome, sotokanda, chiyoda-ku,
Tokyo, 101-0021
Japan
Tel: +81-3-3251-5731
Fax: +81-3-3251-5730
www.n-denkei.co.jp
SANYU ELECTRONIC INDUSTRIAL CO., LTD
(Test & Measurement Instruments)
2F,ALPS LOGISTIC #1 BUILD 1756
NIPPA-CHO,KOHOKU-KU, YOKOHAMA,
KANAGAWA 223-0057 Japan
Tel: +81-45-545-7771
Fax: +81-45-545-7778
www.sanyu-ele.co.jp
TOKYO DENKI SANGYO CO., LTD.
(Test & Measurement Instruments)
1-18-12, Hatagaya, Shibuya-ku,
Tokyo,151-0072 Japan
Tel: +81-3-3481-1111
Fax: +81-3-3481-1125
www.tokyo-densan.co.jp
TOYO Corporation
(Power Testing Equipment)
1-6, Yaesu 1-chome, Chuo-ku,
Tokyo, 103-8284, Japan
Tel: +81-3-3279-0771
Fax: +81-3-3246-0645
E-mail: [email protected]
www.toyo.co.jp
The areas and distributors are listed in alphabetical order.
KOREA
BRIDGE Corporation
(Semiconductor ATE)
901 ho, Byucksan Technopia, 434-6,
Sangdaewon-dong,Jungwon-gu,
Sungnam-si, Kyoungki-do, Korea
Tel: +82-31-747-4011
Fax: +82-31-747-4022
E-mail: [email protected]
www.bridgeitc.com
JEILMI Co., Ltd.
(Test & Measurement Instruments)
9th FL, 401, Simin-daero,
Dongan-gu, Anyang-si,
Gyeonggi-do,
Korea, Zip:14057
Tel: +82-31-463-3700
Fax: +82-31-463-3701
E-mail: [email protected],
[email protected]
www.jeilmi.com
LEEBESTECH
(Test & Measurement Instruments)
Room #520, Shinhan Deview Officetel
1132-19, Guwol-dong, Namdong-gu,
Incheon, South Korea #405-220
Tel: +82-32-437-0367
Fax: +82-32-437-0368
E-mail: [email protected]
[email protected]
NOISE Technology Co., Ltd.
(AC Source, Load, Power Analyzer)
Science Bldg, 3, Pangyo-ro 715
beon-gil, Bundang-gu,
Seongnam-si, Gyeonggi-do,
Korea
Tel: +82-31-781-7816
Fax: +82-31-703-7175
E-mail: [email protected]
www.noisetech.co.kr
TF EastPost Technologies Inc.
(Semiconductor Handler)
Science Bldg, #149-9,
Yatap-dong, Bundang-gu,
Seongnam-si, Kyunggi-do,
463-816, Korea
Tel: +82-31-206-0541
Fax: +82-31-206-0543
E-mail: [email protected]
WE Corporation
(Test & Measurement Instruments)
2F, 85 Nambusunhwanno315gil,
Seocho-gu, Seoul, Korea
Tel: +82-2-585-8253
Fax: +82-2-585-8254
E-mail: [email protected]
www.weco.co.kr
KUWAIT
Didactic Systems & Technology
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
NEW ZEALAND
Electrotest Ltd.
(Test & Measurement Instruments)
PO Box 300 475 , 12A Te Kea Place
Albany, Auckland, New Zealand
Tel: +64-9-448-2600
Fax: +64-9-448-2611
E-mail: [email protected]
www.electrotest.co.nz
NORWAY
IKM Instrutek AS
(Test & Measurement Instruments)
Elveveien 28, N-3262 Larvik, Norway
Tel: +47-33-165700
Fax: +47-33-165701
E-mail: [email protected]
www.ikmwebshop.no
Nortelco Electronics AS
MALAYSIA
Quantel Global Sdn Bhd. (Kuala Lumpur)
(Test & Measurement Instruments)
Unit 802, 8F, Blk A Damansara Intan,
No. 1, Jalan SS20/27, 47400
Petaling Jaya, Selangor,
Malaysia
Tel: +60-3-7726-7435
Fax: +60-3-7726-1961
E-mail: [email protected]
www.quantel-global.com
Quantel Global Sdn Bhd. (Penang)
(Test & Measurement Instruments)
2-3-9 One Square, Tingkat Mahsuri 1
Bayan Lepas, 11950 Penang
Malaysia
Tel: +60-4-646-5110/0780
Fax: +60-4-644-2878
E-mail: [email protected]
www.quantel-global.com
QTEC Technologies Sdn Bhd.
(Head Office)
(PV/LED/Semiconductor ATE & Handler)
3637, Jalan Angkasa Nuri 1,
Taman Angkasa Nuri, 76100
Durian Tunggal, Melaka,
Malaysia
Tel: +60-6-334-2918/2919
Fax: +60-6-334-2920
E-mail: [email protected]
[email protected]
www.qtec.com.my
(Test & Measurement Instruments)
Johan Scharffenbergs vei 95,
0694 Oslo, Norway
Tel: +47 2257 6100
Fax: +47 2257 6130
E-mail: [email protected]
www.nortelcoelectronics.no
OMAN
Didactic Systems & Technology
(Test & Measurement Instruments)
Wadi Al Udhaiba St., Azaiba- Muscat.,
Sultanate of Oman
Tel: +968-24615120
Fax: +968-24615117
E-mail: [email protected]
www.dsat.me
PHILIPPINES
Quantel Global Philippines Corporation
(Manila & Cebu)
(Test & Measurement Instruments)
Units 2401 and 2402 The Orient Square,
F. Ortigas Jr. Road, Ortigas Center,
Psig City, Philippines
Tel: +63-2638-6942/6918 (Manila)
Fax: +63-2638-6946 (Manila)
Tel: +63-32-495-9210 (Cebu)
Fax: +63-32-511-0071 (Cebu)
E-mail: [email protected]
www.quantel-global.com
POLAND
NDN Test & Measurement instruments
(Test & Measurement Instruments)
Janowskiego Str. 15 PL 02-784
Warsaw, Poland
Tel: +48-22-641-1547
Fax: +48-22-644-4250
E-mail: [email protected]
www.ndn.com.pl
PORTUGAL
Instrumentos de Medida, S.L.
(Test & Measurement Instruments)
Septiembre 31, E28022 Madrid
Tel: +34-91-300-0191
Fax: +34-91-388-5433
E-mail: [email protected]
www.idm-instrumentos.es
Lenave Lda
(Test & Measurement Instruments)
R. de S. Paulo 228-232
1200-430 Lisboa, Portugal
Tel: +351-213-223-190
Fax: +351-213-420-968
E-mail: [email protected]
www.lenave.pt
QATAR
Didactic Systems & Technology
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
ROMANIA
EE TEST S.A.
(Test & Measurement Instruments)
Blvd. Industriilor no. 4 ROM-300 714
Timisoara, Romania
Tel: +40-256-491-154
Fax: +40-256-493-468
E-mail:[email protected]
www.eee.ro
TECHNO VOLT s.r.l.
(Test & Measurement Instruments)
Bd. Constructorilor 20A, sector 6,
060512 Bucharest, Romania
Tel: +40-21-220-1302
Fax: +40-21-221-0925
E-mail: [email protected]
www.test-expert.ru/en
RUSSIA
TESTPRIBOR, JSC
(Test & Measurement Instruments)
Office 718 24 Geroev Panfilovtsev
Street, Moscow 125480, Russian
Federation
Tel: +7-495-225-67-37
Fax: +7-495-496-95-55
E-mail: [email protected]
www.test-expert.ru/en
20-4
Global Service Network
YE International
(Test & Measurement Instruments)
Pr. Obukhovskoy Oborony, Block 70,
Building 3A, 192029,
Saint-Petersburg, Russia
Tel: +78-123 133 440
Fax: +78-123 133 441
E-mail: [email protected]
www.yeint.ru
SAUDI ARABIA
Didactic Systems & Technology
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
SPAIN
Enelec S.L.
TUNESIA
Resonance Automation
UKRAINE
SEA Electronics Ukraine LLC
(Test & Measurement Instruments)
Avda. Francesc Macià, 39, 6˚ 2a
08206 Sabadell (Barcelona), Spain
Tel: +34-93-723-0270
Fax: +34-93-723-4717
E-mail: [email protected]
www.enelec.com
(Test & Measurement Instruments)
08 Rue El Aghlab, Borj El Ouzir,
Ariana, Tunisia
(Test & Measurement Instruments)
Building 2, 13-B, Krakovskaya
Str. 02094 Kyiv, Ukraine
Tel: +38-44-291-00-41
Fax: +38-44-291-00-41
www.sea.com.ua
Instrumentos de Medida, S.L.
(Test & Measurement Instruments)
Septiembre 31, E28022 Madrid,
Spain
Tel: +34-91-300-0191
Fax: +34-91-388-5433
E-mail: [email protected]
www.idm-instrumentos.es
TURKEY
Yıldırım Elektronik Tic. Ve San. Ltd. Sti
(Test & Measurement Instruments)
Maresal Fevzi Cakmak Caddesi No:29
06500 Besevler Cankaya/ANKARA
Tel: +90-312-221-1000
Fax: +90-312-212-3535
E-mail: [email protected]
www.yildirimlab.com
www.yildirimelektronik.com
SWEDEN
Combinova AB
(Test & Measurement Instruments)
SINGAPORE
Quantel Pte Ltd. (Head Office)
Domkraftsv. 1, SE-197 40 Bro,
(Test & Measurement Instruments,
Sweden
PV/LED/Semiconductor ATE & Handler) Tel: +46-8-627-9310
Fax: +46-8-295-985
46 Lorong 17 Geylang # 05-02
Enterprise Industrial Building,
E-mail: [email protected]
Singapore 388568
www.combinova.se
Tel: +65-6745-3200
Fax: +65-6745-9764
Nortelco Electronics
E-mail: [email protected]
(Test & Measurement Instruments)
www.quantel-global.com
Sverige, Kanalvägen 1A, SE-194 61,
Upplands Väsby, Sweden
Tel: +46 8 446 0100
SLOVAKIA
H TEST Slovakia spol. s r.o.
Fax: +47 2257 6130
(Test & Measurement Instruments)
E-mail: [email protected]
Zvolenská cesta 20, 97405 Banska
www.nortelcoelectronics.se
Bystrica, Slovensko
Tel: +421-905-785550
SWITZERLAND
E-mail: [email protected]
MESATEC technische Produkte AG
www.htest.sk
(Test & Measurement Instruments)
Sumpfstrasse 3, CH-6300 Zug, Switzerland
Tel: +41-41-740-5833
SOUTH AFRICA
Intercal cc
Fax: +41-41-740-5834
(Test & Measurement Instruments)
E-mail: [email protected]
Labotec Park 21 Bavaria Road
www.mesatec.ch
Randjespark Midrand,
South Africa
THAILAND
Tel: +27-11-315-4321
Quantel Global Co., Ltd
Fax: +27-11-312-1322
(Test & Measurement Instruments)
E-mail: [email protected]
2170 Bangkok Tower, 5th Floor,
www.intercal.co.za
Room No. 502, New Petchaburi Road,
Bangkapi, Huay Kwang Bangkok,
10310, Thailand
Tel: +66-2-308-0881-3
Fax:+66-2-308-0884
E-mail: [email protected]
www.quantel-global.com
20-5
Tel: +216-507-903-37
E-mail: [email protected]
www.resonance-automation.com
UNITED ARAB EMIRATES
Didactic Systems & Technology (Abudhabi)
(Test & Measurement Instruments)
M:03, Bldng No:P/09, Etihad,
Muroor Road, Abu Dhab,
P.O.Box NO: 73260
Tel: +971-2-4918981
Fax: +971-2-4918982
E-mail: [email protected]
www.dsat.me
Didactic Systems & Technology
(Al Ain)
(Test & Measurement Instruments)
Hele, Rumaila
Tel: +971-3-7662230
Fax: +971-3-7631047
E-mail: [email protected]
www.dsat.me
Didactic Systems & Technology
(Dubai)
(Test & Measurement Instruments)
114,Saleh Bin Lahej (Chilis Building), Al
Garhoud, Dubai, P.O Box:233658
Tel: +971-4-2525160
Fax: +971-4-2525161
E-mail: [email protected]
www.dsat.me
UNITED KINGDOM
MDL Technologies Ltd.
(Test & Measurement Instruments)
Unit 11 Devonshire Business Centre Works
Road Letchworth Herts SG61GJ,
United Kingdom
Tel: +44-146-243-1981
Fax: +44-560-315-2515
E-mail: [email protected]
www.mdltechnologies.co.uk
VIETNAM
Quantel Global Vietnam Co. Ltd. (Hanoi)
(Test & Measurement Instruments)
Floor 6th, HL Tower, Lot A2B, Lane 82,
Duy Tan Road, Dich Vong Hau Ward,
Cau Giay district, Hanoi, Vietnam
Tel: +84 4 3226 2510
Fax: +84 4 3226 2511
E-mail: [email protected]
www.quantel-global.com
Quantel Global Vietnam Co. Ltd. (HCM)
(Test & Measurement Instruments)
4.14-4.15, The Prince Residence,
17-19-21 Nguyen Van Troi,
Phu Nhuan, Ho Chi Minh,
Vietnam
Tel: +84-4-3226-2510
Fax: +84-4-3226-2511
E-mail: [email protected]
www.quantel-global.com
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Test & Measurement Product Catalog
TM
2017
Distributed by:
Worldwide Distribution and Service Network
201703-3570
Test & Measurement
2017 Product Catalog
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