IEEE P269/D25 October 2004 1 2 3 4 IEEE P269/D23D25 (Revision of IEEE Std 269-2002) 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 Draft Standard Methods for Measuring Transmission Performance of Analog and Digital Telephone Sets, Handsets, and Headsets Prepared by the Subcommittee on Telephone Instrument Testing of the Transmission, Access and Optical Systems Committee of the IEEE Communications Society (formerly the IEEE Communication Technology Group). Copyright © 2002 by the Institute of Electrical and Electronics Engineers, Inc. Three Park Avenue New York, New York 10016-5997, USA All rights reserved. This document is an unapproved draft of a proposed IEEE Standard. As such, this document is subject to change. USE AT YOUR OWN RISK! Because this is an unapproved draft, this document must not be utilized for any conformance/compliance purposes. Permission is hereby granted for IEEE Standards Committee participants to reproduce this document for purposes of IEEE standardization activities only. Prior to submitting this document to another standards development organization for standardization activities, permission must first be obtained from the Manager, Standards Licensing and Contracts, IEEE Standards Activities Department. Other entities seeking permission to reproduce this document, in whole or in part, must obtain permission from the Manager, Standards Licensing and Contracts, IEEE Standards Activities Department. IEEE Standards Activities Department Standards Licensing and Contracts 445 Hoes Lane, P.O. Box 1331 Piscataway, NJ 08855-1331, USA Abstract: Practical methods for making laboratory measurements of electroacoustic characteristics of analog and digital telephones, handsets and headsets. The methods may also be applicable to a wide variety of other communications equipment, including cordless, wireless and mobile communications devices. Measurement results may be used to evaluate these devices on a standardized basis. Application is in the frequency range from 100 to 8,500 Hz. Keywords: analog telephones, digital telephones, handsets, headsets, electroacoustic measurements on telephones, telephony, voice transmission performance. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 1 IEEE P269/D25 October 2004 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 Introduction (This introduction is not a part of IEEE P269, IEEE Draft Standard Methods for Measuring Transmission Performance of Analog and Digital Telephone Sets, Handsets, and Headsets.) This standard has been prepared in response to a widely expressed need by the telecommunications industry for a standard, comprehensive method for testing the transmission performance of telephone sets, handset, and headsets. The present standard is a revision of IEEE Std 269-1992. This revision adds coverage for a wide range of ear simulators and test signals, and incorporates and updates the contents of IEEE Std 1206-1994. The IEEE will maintain this standard current with the state of the technology. Comments on this standard and suggestions for the additional material that should be included are invited. Comments should be addressed to: Secretary, IEEE Standards Board, The Institute of Electrical and Electronics Engineers, Inc., 345 East 47th Street, New York, NY 10017. This revision, begun in 1999, was prepared by the Subcommittee on Telephone Instrument Testing of the Transmission, Access and Optical Systems Committee of the IEEE Communications Society (formerly the IEEE Communication Technology Group). At the time this standard was approved the members of the subcommittee were as follows: John Bareham, Chair Glenn Hess, Vice Chair Steve Graham, Secretary Roger Britt Chandru Butani Rodolfo Ceruti Cliff Chamney Paul Coverdale Fred Dekalb Gijs Dirks 68 69 70 71 Dan Foley H. W. Gierlich Deborah Gruenhagen Roger Gutzwiller Joe Helms Soren Jonsson Frederick M. Kruger Ron Magnuson Henry Mar Christopher J. Struck Steve Temme Stephen Whitesell Allen Woo Robert Young The following members of the balloting committee voted on this standard: John Bareham Chandru Butani Cliff Chamney Fred Dekalb Dan Foley Steve Graham Deborah Gruenhagen Roger Gutzwiller Glenn Hess Frederick M. Kruger Ron Magnuson Henry Mar Christopher J. Struck Stephen Whitesell Allen Woo Robert Young 72 73 74 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 2 IEEE P269/D25 October 2004 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 Contents 1 2 3 4 5 6 7 Overview .............................................................................................................................................................. 9 1.1 Scope .............................................................................................................................................................. 9 1.2 Purpose ........................................................................................................................................................... 9 1.3 Contents of standard ....................................................................................................................................... 9 References........................................................................................................................................................... 11 Definitions .......................................................................................................................................................... 13 Abbreviations, Acronyms and Symbols.............................................................................................................. 16 4.1 Abbreviations and acronyms ........................................................................................................................ 16 4.2 Symbols ........................................................................................................................................................ 16 Test Equipment and Setup .................................................................................................................................. 18 5.1 Ear simulators............................................................................................................................................... 18 5.1.1 Selection.............................................................................................................................................. 18 5.1.2 Headset measurements made on ear simulators compared to real ears............................................... 18 5.1.3 Translation from DRP to ERP ............................................................................................................ 19 5.2 Mouth simulators.......................................................................................................................................... 19 5.3 Test Fixtures ................................................................................................................................................. 19 5.3.1 Selection.............................................................................................................................................. 19 5.3.2 Handset positioning ............................................................................................................................ 20 5.3.3 Headset positioning......................................................................................................................242423 5.4 Measurement microphones........................................................................................................................... 27 5.5 Test environment .......................................................................................................................................... 27 5.5.1 Background noise level................................................................................................................282827 5.5.2 Reflection-free conditions............................................................................................................282827 5.5.3 Diffuse field conditions....................................................................................................................... 28 5.6 Acoustic impairments................................................................................................................................... 29 5.6.1 Reference corner ................................................................................................................................. 29 5.6.2 Hoth room noise...........................................................................................................................303029 Calibration ...................................................................................................................................................313130 6.1 General ..................................................................................................................................................313130 6.2 Electrical measurement instruments ......................................................................................................313130 6.3 Measurement microphones....................................................................................................................313130 6.4 Ear simulator .........................................................................................................................................313130 6.5 Measurement bandwidth and resolution................................................................................................313130 6.6 Electrical test signals .............................................................................................................................313130 6.6.1 Electrical test spectrum ................................................................................................................323231 6.6.2 Electrical test level.......................................................................................................................323231 6.7 Mouth simulator ....................................................................................................................................323231 6.7.1 Acoustic test spectrum .................................................................................................................323231 6.7.2 Acoustic test level ........................................................................................................................333332 6.7.3 Mouth simulator calibration procedure........................................................................................333332 Test Procedure for Analog Sets ...................................................................................................................343433 7.1 General ..................................................................................................................................................343433 7.1.1 Choice of test signals and levels ..................................................................................................343433 7.1.2 Measurement bandwidth and resolution ......................................................................................343433 7.1.3 Choice of ear and mouth simulators and test position..................................................................353534 7.1.4 Tone control setting .....................................................................................................................353534 7.1.5 Reference receive volume control setting ....................................................................................353534 7.1.6 Reference send gain control setting .............................................................................................353534 7.2 Analog DC Feed circuits .......................................................................................................................353534 7.3 Analog telephone network impairments................................................................................................373736 7.3.1 Loop current.................................................................................................................................373736 7.3.2 Network noise ..............................................................................................................................373736 7.3.3 Termination impedance ...............................................................................................................373736 7.3.4 Test loops.....................................................................................................................................383837 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 3 IEEE P269/D25 October 2004 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 7.3.5 Parallel sets ..................................................................................................................................383837 7.3.6 Cordless range..............................................................................................................................403938 7.4 Receive ..................................................................................................................................................403938 7.4.1 Receive frequency response.........................................................................................................403938 7.4.2 Receive noise ...............................................................................................................................404039 7.4.3 Receive narrow-band noise..........................................................................................................414039 7.4.4 Receive linearity ..........................................................................................................................414039 7.4.5 Receive distortion ........................................................................................................................414140 7.4.6 Receive mute leakage ..................................................................................................................414140 7.5 Send .......................................................................................................................................................424140 7.5.1 Send frequency response..............................................................................................................424140 7.5.2 Send noise ...................................................................................................................................424241 7.5.3 Send narrow-band noise...............................................................................................................424241 7.5.4 Send linearity ...............................................................................................................................434241 7.5.5 Send distortion .............................................................................................................................434342 7.5.6 Send mute leakage .......................................................................................................................434342 7.5.7 Send frequency response in a diffuse field...................................................................................444342 7.5.8 Send signal-to-noise ratio.............................................................................................................444443 7.6 Sidetone .................................................................................................................................................444443 7.6.1 Talker sidetone frequency response .............................................................................................444443 7.6.2 Listener sidetone frequency response ..........................................................................................454443 7.6.3 Alternate method for listener sidetone .........................................................................................454544 7.6.4 Sidetone linearity .........................................................................................................................464544 7.6.5 Sidetone distortion .......................................................................................................................464645 7.6.6 Sidetone delay..............................................................................................................................464645 7.6.7 Sidetone echo response ................................................................................................................464645 7.7 Overall ...................................................................................................................................................474645 7.7.1 Overall frequency response..........................................................................................................474645 7.7.2 Overall linearity ...........................................................................................................................474645 7.7.3 Overall distortion .........................................................................................................................474746 7.8 Telephone set impedance ......................................................................................................................474746 7.8.1 AC impedance..............................................................................................................................484746 7.8.2 Return loss ...................................................................................................................................484746 7.9 Howling .................................................................................................................................................484847 7.10 Maximum acoustic output ................................................................................................................494847 7.10.1 Maximum acoustic pressure (long duration)................................................................................494948 7.10.2 Peak acoustic pressure (short duration)........................................................................................494948 8 Test Procedures for Digital and 4-wire Systems..........................................................................................504948 8.1 General ..................................................................................................................................................504948 8.1.1 Choice of test signals and levels ..................................................................................................505049 8.1.2 Measurement bandwidth and resolution ......................................................................................505049 8.1.3 Choice of ear and mouth simulators and test position..................................................................515049 8.1.4 Tone control setting .....................................................................................................................515049 8.1.5 Reference receive volume control................................................................................................515049 8.1.6 Reference send gain control setting .............................................................................................515150 8.2 Digital test circuits.................................................................................................................................515150 8.2.1 Digital telephone interface ...........................................................................................................515150 8.2.2 Reference codec ...........................................................................................................................535251 8.2.3 Wideband reference codec ...........................................................................................................535352 8.3 Digital telephone network impairments.................................................................................................545352 8.3.1 Network Delay .............................................................................................................................545453 8.3.2 Jitter .............................................................................................................................................545453 8.3.3 Network Packet Loss ...................................................................................................................555453 8.3.4 Network Echo Canceller ..............................................................................................................555453 8.3.5 Discontinuous Speech Transmission............................................................................................555554 8.4 Receive ..................................................................................................................................................555554 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 4 IEEE P269/D25 October 2004 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 202 203 204 205 206 207 208 209 210 211 212 213 214 215 216 217 218 219 220 221 222 223 224 225 226 227 228 229 230 231 232 233 234 235 236 237 238 239 240 8.4.1 Receive frequency response.........................................................................................................555554 8.4.2 Receive noise ..............................................................................................................................565554 8.4.3 Receive narrow-band noise..........................................................................................................565554 8.4.4 Receive linearity ..........................................................................................................................565655 8.4.5 Receive distortion ........................................................................................................................565655 8.4.6 Receive mute leakage ..................................................................................................................575655 8.4.7 Receive delay ...............................................................................................................................575756 8.4.8 Receive out-of-band signals.........................................................................................................575756 8.5 Send .......................................................................................................................................................585756 8.5.1 Send frequency response..............................................................................................................585756 8.5.2 Send noise ....................................................................................................................................585857 8.5.3 Send narrow-band noise...............................................................................................................585857 8.5.4 Send linearity ...............................................................................................................................595857 8.5.5 Send distortion .............................................................................................................................595857 8.5.6 Send mute leakage .......................................................................................................................595958 8.5.7 Send delay....................................................................................................................................595958 8.5.8 Send out-of-band susceptibility ...................................................................................................605958 8.5.9 Send frequency response in a diffuse field...................................................................................606059 8.5.10 Send signal-to-noise ratio.............................................................................................................606059 8.6 Sidetone .................................................................................................................................................606059 8.6.1 Talker sidetone frequency response .............................................................................................616059 8.6.2 Listener sidetone frequency response ..........................................................................................616160 8.6.3 Alternate method for listener sidetone .........................................................................................626160 8.6.4 Sidetone linearity .........................................................................................................................626261 8.6.5 Sidetone distortion .......................................................................................................................626261 8.6.6 Sidetone delay..............................................................................................................................636261 8.6.7 Sidetone echo response ................................................................................................................636261 8.7 Overall ...................................................................................................................................................636261 8.7.1 Overall frequency response..........................................................................................................636261 8.7.2 Overall linearity ...........................................................................................................................636362 8.7.3 Overall distortion .........................................................................................................................646362 8.8 Echo frequency response .......................................................................................................................646362 8.9 Temporally weighted terminal coupling loss ........................................................................................656463 8.10 Stability loss .....................................................................................................................................656564 8.11 Convergence time .............................................................................................................................666564 8.12 Discontinuous speech transmission ..................................................................................................666665 8.12.1 General.........................................................................................................................................666665 8.12.2 Measurement method...................................................................................................................666665 8.13 Maximum acoustic output ................................................................................................................676766 8.13.1 Maximum acoustic pressure (long duration)................................................................................676766 8.13.2 Peak acoustic pressure (short duration)........................................................................................686766 9 Test Procedures for Analog 4-wire Handsets and Headsets ........................................................................706968 9.1 General ..................................................................................................................................................706968 9.1.1 Choice of test signals and levels ..................................................................................................706968 9.1.2 Measurement bandwidth and resolution ......................................................................................706968 9.1.3 Choice of ear and mouth simulators and test position..................................................................717069 9.1.4 Tone control setting .....................................................................................................................717069 9.1.5 Default receive volume control and send gain adjustment...........................................................717069 9.2 Handset and headset test circuits ...........................................................................................................717069 9.3 Receive ..................................................................................................................................................737271 9.3.1 General.........................................................................................................................................737271 9.3.2 Receive volume control adjustment .............................................................................................737271 9.3.3 Receive frequency response............................................................................................................ 7472 9.3.4 Receive noise ..............................................................................................................................747372 9.3.5 Receive narrow-band noise..........................................................................................................747372 9.3.6 Receive linearity ..........................................................................................................................747372 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 5 IEEE P269/D25 October 2004 241 242 243 244 245 246 247 248 249 250 251 252 253 254 255 256 257 258 259 260 261 262 263 264 265 266 267 268 269 270 271 272 273 274 275 276 277 278 279 280 281 282 283 284 285 286 287 288 289 290 291 292 293 294 295 296 9.3.7 Receive distortion ........................................................................................................................757473 9.3.8 AC impedance..............................................................................................................................757473 9.3.9 DC resistance ...............................................................................................................................757473 9.4 Send .......................................................................................................................................................757473 9.4.1 Send gain control adjustment .......................................................................................................757473 9.4.2 Send frequency response................................................................................................................. 7674 9.4.3 Send noise ....................................................................................................................................767574 9.4.4 Send narrow-band noise...............................................................................................................767574 9.4.5 Send linearity ...............................................................................................................................767574 9.4.6 Send distortion .............................................................................................................................777675 9.4.7 Send frequency response in a diffuse field...................................................................................777675 9.4.8 Send signal-to-noise ratio................................................................................................................ 7876 9.4.9 AC impedance..............................................................................................................................787776 9.4.10 DC resistance ...............................................................................................................................787776 9.5 Echo frequency response .......................................................................................................................787776 9.6 Maximum acoustic output .....................................................................................................................797877 9.6.1 Maximum acoustic pressure (long duration)................................................................................797877 9.6.2 Peak acoustic pressure (short duration)........................................................................................797877 Annex A (normative) Ear Simulators with Flexible Pinnas and Positioning Devices......................................807978 A.1 General characteristics of the ear simulators ....................................................................................807978 A.2 Differences between the two ear simulators .....................................................................................807978 A.3 Handset Positioning devices .............................................................................................................818079 Annex B (normative) Alternative Ear Simulators, Mouth Simulator and Test Fixture....................................828180 B.1 Alternative Ear Simulators................................................................................................................828180 B.2 Alternative Mouth Simulator ............................................................................................................848382 B.2.1 General.........................................................................................................................................848382 B.2.2 Calibration of Alternative Mouth Simulator ...............................................................................848382 B.3 Alternative Test Fixture ....................................................................................................................858483 Annex C (normative) DRP TO ERP and Related Translations........................................................................868584 Annex D (normative) Conditioning for Carbon Transmitters ..........................................................................908988 Annex E (normative) Hoth Room Noise..........................................................................................................919089 Annex F (normative) Test Signals ..................................................................................................................939291 F.1 General ..................................................................................................................................................939291 F.2 Classifications .......................................................................................................................................939291 F.3 Modulation types ...................................................................................................................................939291 F.3.1 Square wave modulation..............................................................................................................949392 F.3.2 Sine wave modulation..................................................................................................................949392 F.3.3 Pseudo-random modulation .........................................................................................................949392 F.4 Deterministic signals .............................................................................................................................949392 F.4.1 Sine wave.....................................................................................................................................949392 F.4.2 Pseudo-random ............................................................................................................................949392 F.5 Random signals .....................................................................................................................................959493 F.5.1 White noise ..................................................................................................................................959493 F.5.2 Pink noise.....................................................................................................................................959493 F.5.3 P.50 noise.....................................................................................................................................959493 F.6 Speech-like signals ................................................................................................................................959493 F.6.1 Simulated speech .........................................................................................................................959493 F.6.2 Synthesized speech ......................................................................................................................969594 F.6.3 Real speech ..................................................................................................................................969594 F.7 Compound signals .................................................................................................................................979695 F.7.1 Sequential presentation ................................................................................................................979695 F.7.2 Simultaneous presentation ...........................................................................................................979695 F.8 Test signal bandwidth............................................................................................................................999897 F.9 Signal parameter summary ..................................................................................................................1009998 F.10 Test signals published on CD-ROM ...............................................................................................1009998 F.11 Signal and test method comparative summary .............................................................................10110099 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 6 IEEE P269/D25 October 2004 297 298 299 300 301 302 303 304 305 306 307 308 309 310 311 312 313 314 315 316 317 318 319 320 321 322 323 324 325 326 327 328 329 330 331 332 333 334 335 336 337 338 339 340 341 342 343 344 345 346 347 348 349 350 351 352 Annex G (normative) Analysis Methods...................................................................................................102101100 G.1 General .......................................................................................................................................102101100 G.2 Fast Fourier transform (FFT) and cross spectrum analysis.........................................................103102101 G.2.1 Dual-channel FFT ..................................................................................................................103102101 G.2.2 Single-channel FFT................................................................................................................103102101 G.2.3 Maximum length sequence (MLS) analysis...........................................................................103102101 G.3 Real-time filter analysis (RTA) ..................................................................................................103102101 G.3.1 Dual-channel real-time filter analysis ....................................................................................104103102 G.3.2 Single-channel real-time filter analysis..................................................................................104103102 G.4 Sine-based analysis.....................................................................................................................104103102 G.4.1 Discrete tone (stepped sine) ...................................................................................................104103102 G.4.2 Swept sine ..............................................................................................................................104103102 G.4.3 Time delay spectrometry (TDS) ............................................................................................104103102 G.5 Simulated free field techniques...................................................................................................105104103 G.6 Measurement bandwidth.............................................................................................................105104103 G.7 Measurement resolution..............................................................................................................106105104 Annex H (normative) Loudness Rating Calculations .......................................................................................110108 Annex I (normative) Linearity ........................................................................................................................112110 Annex J (normative) Distortion ......................................................................................................................117115 J.1 Overview ...............................................................................................................................................117115 J.2 Signal suitability test .............................................................................................................................117115 J.3 Signal-to-distortion-and-noise ratio (SDN) ...........................................................................................117115 J.4 Sinusoidal Methods ...............................................................................................................................118116 J.4.1 Total harmonic distortion (THD) and harmonic analysis ............................................................119116 J.4.2 Total Harmonic Distortion (THD) and noise ...............................................................................119117 J.4.3 Difference-frequency distortion (DF Distortion) .........................................................................122118 J.4.4 Intermodulation distortion (IM Distortion) ..................................................................................122119 J.4.5 Alternatives to sinewave stimulus signals....................................................................................122119 J.4.6 Test frequencies ...........................................................................................................................122119 J.5 Coherence methods (N/C Ratio)............................................................................................................123119 Annex K (normative) Send Signal-to-Noise Ratio ...........................................................................................125121 K.1 Send signal-to-noise ratio .................................................................................................................125121 K.2 Weighted send signal-to-noise ratio .................................................................................................125121 Annex L (normative) Delay .............................................................................................................................127123 L.1 General ..................................................................................................................................................127123 L.2 Captured pulse method ..........................................................................................................................127123 L.3 Two-channel analyzer methods .............................................................................................................127123 L.3.1 Impulse response method.............................................................................................................127123 L.3.2 Cross-correlation method.............................................................................................................127123 L.4 Time Delay Spectrometry Method ........................................................................................................127123 L.5 MLS Method .........................................................................................................................................128124 Annex M (normative) Sidetone Echo ...............................................................................................................129125 Annex N (informative) Maximum Acoustic Pressure Limits...........................................................................130126 N.1 Abstract.............................................................................................................................................130126 N.2 Introduction ......................................................................................................................................130126 N.3 Proposal ............................................................................................................................................133129 Annex O (normative) Temporally weighted terminal coupling loss measurement method .............................135131 O.1 General .............................................................................................................................................135131 O.2 Initial signal processing ....................................................................................................................135131 O.3 Modeling echo audibility ..................................................................................................................135131 O.3.1 Frequency weighting....................................................................................................................136132 O.3.2 Temporal combination .................................................................................................................136132 O.3.3 Temporal weighting .....................................................................................................................136132 O.4 Expressing TCL Results ...................................................................................................................137133 Annex P (normative) Temporally weighted terminal coupling loss algorithm................................................139135 P.1 General ..................................................................................................................................................139135 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 7 IEEE P269/D25 October 2004 353 354 355 356 357 358 359 360 361 362 363 364 365 366 367 368 369 370 371 372 373 374 375 376 377 P.2 TCLT Algorithm ....................................................................................................................................139135 P.2.1 Step 1: measure EPD ...................................................................................................................139135 P.2.2 Step 2: align signals .....................................................................................................................140136 P.2.3 Step 3: apply A-weighting ...........................................................................................................140136 P.2.4 Step 4: subtract noise (conditional)..............................................................................................140136 P.2.5 Step 5: 4ms frames.......................................................................................................................140136 P.2.6 Step 6: initialization .....................................................................................................................140136 P.2.7 Step 7: calculations ......................................................................................................................141137 P.2.8 Step 8: calculate parameters.........................................................................................................142138 P.2.9 Step 9: output statistics ................................................................................................................142138 Annex Q (normative) Simulated Speech Generator (SSG) ..............................................................................143139 Annex R (normative) TDS Sweep with P.50 Noise Bursts..............................................................................145141 Annex S (informative) Use of the Free Field as the Telephonometric Reference Point .................................146142 Annex T (informative) Useful Conversion Procedures...................................................................................148144 T.1 Conversions for dBV to dBm, and for 600 and 900...........................................................................148144 T.2 Conversions for dBmp to dBrnC for electrical noise measurements.....................................................149145 T.3 Loudness rating conversions .................................................................................................................149145 T.4 Acoustic sound pressure conventions....................................................................................................149145 Annex U (informative) Loudness Balance Subjective Test Procedure ...........................................................150146 U.1 Introduction ......................................................................................................................................150146 U.2 Loudness balance test procedure ......................................................................................................150146 U.3 Example test circuit ..........................................................................................................................151147 U.4 Estimate of test headset receive characteristics ................................................................................152148 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 8 IEEE P269/D25 October 2004 377 378 379 Draft Standard Methods for Measuring Transmission Performance of Analog and Digital Telephone Sets, Handsets, and Headsets 380 381 1 Overview 382 383 384 385 386 387 388 389 390 391 392 393 394 395 396 397 398 Objective or subjective methods can be used to measure telephone transmission performance. This standard discusses objective procedures utilizing mouth simulators, ear simulators, laboratory microphones and test instruments to characterize transmission performance. Subjective procedures are particularly applicable for rating overall communication connections involving the real voice and real ear of human subjects. Telephones, handsets, and headsets can be evaluated by purely objective methods provided the results generally agree with the desirable performance characteristics of subjective testing. 399 1.1 400 401 402 403 404 405 406 407 408 409 410 411 412 This standard provides the techniques for objective measurement of electroacoustic characteristics of analog and digital telephones, handsets and headsets. Application is in the frequency range from 100 to 8,500 Hz. 413 1.2 414 415 416 417 The purpose of this standard is to provide practical methods for making laboratory measurements of the transmission characteristics of analog and digital telephones, handsets and headsets so that their performance may be evaluated on a standardized basis. 418 1.3 419 420 421 This is a brief summary of the clauses contained in the standard. The primary measurement procedures appear in Clause 7 through Clause 9 of the document. The relationships that are established between subjective and objective measurements will vary with the physical constants of the telephone design, such as the size and shape of the handset or headset, the sound leakage between the receiver and the ear of the user, and the signal processing in the speech path. Therefore, the correlation between subjective and objective measurements should be established separately for each telephone, headset or handset design before measurements obtained using the techniques covered herein can be interpreted to reflect performance under conditions of actual use. Execution of this standard provides a means of determining the operational characteristics of a telephone over the range of conditions encountered during normal operation. Scope Although not specifically within the scope of this standard, the methods described are generally applicable to a wide variety of other communications equipment, including cordless, wireless and mobile communications devices. Telephones with handsfree or loudspeaking features are covered by IEEE Standard 1329-1999, Method for Measuring Transmission Performance of Handsfree Telephone Sets. Due to the various characteristics of these devices and the environments in which they operate, not all of the test procedures in this standard are applicable to all types of telephones, handsets or headsets. Application of the test procedures to atypical telephones should be determined on an individual basis. Purpose Contents of standard Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 9 IEEE P269/D25 October 2004 422 423 424 425 426 427 428 429 430 431 432 433 434 435 436 437 438 439 440 441 442 443 444 Clauses 2, 3 and 4 provide references, definitions, abbreviations, acronyms, and symbols which will be useful in executing the tests of this standard. These clauses provide a background in the terminology used for telephone, handset, and headset testing. Clause 5 specifies the test equipment, test environment and acoustic impairments. The test equipment portion includes ear and mouth simulators, test fixtures, and measurement microphones, as well as procedures for positioning the telephone handset or headset for testing. The test environment includes both the acoustical and physical characteristics of the test space. Impairments include the acoustic conditions. Clause 6 describes the calibration procedures needed to ensure that the equipment is in a known state. Calibration of the acoustic transducers and electrical interfaces is explained. Clauses 7, 8 and 9 contain the transmission test procedures, such as send and receive, for analog telephones, digital telephones, and analog 4-wire handsets and headsets, respectively. Attached annexes contain additional information or details of procedures referred to from within the relevant clause. Normative annexes contain information which is considered to be an official part of the standard. Informative annexes contain information which may be useful, or of general interest, but are not part of the standard. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 10 IEEE P269/D25 October 2004 444 445 446 447 448 449 450 451 452 453 454 455 456 457 458 459 460 461 462 463 464 465 466 467 468 469 470 471 472 473 474 475 476 477 478 479 480 481 482 483 484 485 486 487 488 489 490 491 492 493 494 495 496 497 2 References This standard shall be used in conjunction with the following publications. When the following standards are superseded by an approved standard, the revision shall apply but the impact on results should be determined. ANSI S1.1-1994 (Reaff. 1999), American National Standard Acoustical Terminology. ANSI S1.4-1983 (Reaff. 2001), American National Standard Specification for Sound Level Meters. ANSI S1.6-1984 (Reaff. 2001), American National Standard Preferred Frequencies, Frequency Levels, and Band Numbers for Acoustical Measurements. ANSI S1.11-1986 (Reaff. 1998), American National Standard Specifications for Octave Band and Fractionaloctave-band Analog and Digital Filters. ANSI S1.12-1967 (Reaff. 1997), American National Standard Specifications for Laboratory Standard Microphones. ANSI/TIA/EIA-810-A-2000, Transmission Requirements for Narrowband Voice over IP and Voice over PCM Digital Wireline Telephones. IEC 61000-4-5 (2001), Electromagnetic compatibility (EMC) –Part 4-5: Testing and measurement techniques – Surge immunity test. I EEE10 0™,The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition. IEEE Std 661-1979 (Reaff. 1998), IEEE Standard Method for Determining Objective Loudness Ratings of Telephone Connections. IEEE Std 743-1995, IEEE Standard Equipment Requirements and Measurement Techniques for Analog Transmission Parameters for telecommunications IEEE Std 1329-1999, IEEE Standard Method for Measuring Transmission Performance of Handsfree Telephone Sets. ISO 3 (1973) Preferred Numbers-Series of preferred Numbers. ITU-T Recommendation G.122 (1993), Influence of National Systems on Stability and Talker Echo in International Connections. ITU-T Recommendation G.131 (1996), Control of Talker Echo. ITU-T Recommendation G.711 (1988), Pulse Code Modulation (PCM) of Voice Frequencies. ITU-T Recommendation G.714 (1988), Separate Performance Characteristics for the Encoding and Decoding Sides of PCM Channels Applicable to 4-wire Voice-frequency Interfaces. ITU-T Recommendation G.722 (1988), 7 kHz Audio-coding Within 64 kbit/s. ITU-T Recommendation G.723 (1988), Extensions of Recommendation G.721 Adaptive Differential Pulse Code Modulation to 24 and 40 kbit/s for Digital Circuit Multiplication Equipment Application. ITU-T Recommendation G.726 (1990), 40, 32, 24, 16 kbit/s Adaptive Differential Pulse Code Modulation (ADPCM). Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 11 IEEE P269/D25 October 2004 498 499 500 501 502 503 504 505 506 507 508 509 510 511 512 513 514 515 516 517 518 519 520 521 522 523 524 525 526 527 528 529 530 ITU-T Recommendation G.729 (1996), Coding of Speech at 8 kbit/s Using Conjugate-structure Algebraic-codeexcited Linear-prediction (CS-ACELP). ITU-T Recommendation O.41 (1994), Psophometer for Use on Telephone-type Circuits. ITU-T Recommendation O.133 (1993), Equipment for Measuring the Performance of PCM Encoders and Decoders. ITU-T Recommendation P.50 (1999), Artificial Voices. ITU-T Recommendation P.50, Appendix 1 (1998), Test Signals. ITU-T Recommendation P.51 (1996), Artificial Mouths. ITU-T Recommendation P.56 (1993), Objective Measurement of Active Speech Level. ITU-T Recommendation P.57 (1996), Artificial Ears. ITU-T Recommendation P.58 (1996), Head and Torso Simulator for Telephonometry. ITU-T Recommendation P.59 (1993), Artificial Conversational Speech. ITU-T Recommendation P.64 (1999), Determination of Sensitivity/Frequency Characteristics of Local Telephone Systems. ITU-T Recommendation P.79 (1999), Calculation of Loudness Ratings for Telephone Sets. ITU-T Recommendation P.501 (2000), Test Signals for Use in Telephonometry. ITU-T Recommendation P.862 (2001), Perceptual Evaluation of Speech Quality (PESQ), an Objective Method for End-to-end Speech Quality Assessment of Narrowband Telephone Networks and Speech Codecs. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 12 IEEE P269/D25 October 2004 530 531 532 533 534 535 536 537 538 539 540 541 542 543 544 545 546 547 548 549 550 551 552 553 554 555 556 557 558 559 560 561 562 563 564 565 566 567 568 569 570 571 572 573 574 575 576 577 578 579 580 581 582 583 3 Definitions These definitions apply specifically to measurements of the transmission performance of telephone sets, handsets, and headsets and may not be applicable to other disciplines. For definitions not covered, see IEEE 100 and ANSI S1.1-1994. 3.1 A-weighted. A measurement made using the A frequency weighting specified in ANSI S1.4-1983. Aweighted sound pressure level is expressed as dBA, and the reference level is always 20 micropascals. 3.2 acoustic echo path. The acoustic coupling from the handset or headset receiver to the handset or headset microphone. 3.3 acoustic input. The free-field sound pressure level developed by a mouth simulator at the mouth reference point. See sound pressure level. 3.4 acoustic output. The sound pressure level developed in an ear simulator. See sound pressure level. 3.5 analog telephone set. A telephone set in which the two-way voice communication interface to the network is in an analog format. 3.6 boom microphone position (BMP). The default point at which to place a boom microphone for testing on a mouth simulator. It is specified as measurement point #21 in ITU-T Recommendation P.58. With respect to the intersection of the mouth reference axis with the lip plane, it is located 6mm back towards the mouth, 42mm to the right (or left), and 9mm downward. 3.7 codec. A combination of an analog-to-digital encoder and a digital-to-analog decoder operating in opposite directions of transmission within the same equipment. 3.8 dBA. Sound pressure level in decibels, relative to 20 micropascals, A-weighted (3.1). 3.9 dBm. Power level in decibels, relative to a power of 1 mW (milliwatt). 3.10 dBm0. Power level in dBm, relative to a reference point called the zero transmission level point, or 0 TLP. (See 3.52). A signal level of X dBm at the 0 TLP is designated X dBm0. In a codec, the 0 TLP is specified in relationship to the full-scale digital level or saturation. However, digital saturation is generally not 0 dBm0. For -law codecs 0 dBm0 is 3.17 dB below digital full scale. For A-law codecs 0 dBm0 is 3.14 dB below digital full scale. 3.11 dBm(A). Power level in decibels, relative to a power of 1 mW (milliwatt), A-weighted (3.1). 3.12 dBmp. Power level in decibels, relative to a power of 1mW (milliwatt), measured with psophometric weighting defined in ITU-T Recommendation O.41. 3.13 dBPa. Sound pressure level in decibels, relative to a sound pressure of 1 Pa (pascal). 3.14 dBSPL. Sound pressure level in decibels, relative to a sound pressure of 20 micropascals. 3.15 dBV. Voltage level in decibels, relative to 1 volt rms. 3.16 dBV(A). Voltage level in decibels, relative to 1 volt rms, measured with A-weighting (3.1). 3.17 dBV(p). Voltage level in decibels, relative to 1 volt rms, measured with psophometric weighting defined in ITU-T Recommendation O.41. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 13 IEEE P269/D25 October 2004 584 585 586 587 588 589 590 591 592 593 594 595 596 597 598 599 600 601 602 603 604 605 606 607 608 609 610 611 612 613 614 615 616 617 618 619 620 621 622 623 624 625 626 627 628 629 630 631 632 633 634 635 636 637 638 639 3.18 digital telephone set. A telephone set in which the two-way voice communication interface to the network is in a digital format. 3.19 ear cap reference point. The intersection of the external ear-cap reference plane with a normal axis through the effective acoustic center of the sound outlet ports. Generally, the acoustic center of the sound outlet ports is at the center of their distribution. 3.20 ear reference point.. A virtual point for geometric and acoustic reference located outside the entrance to the ear canal. The exact location is specified for each type of ear simulator. 3.21 feed circuit. An electrical circuit for supplying dc power to a telephone set and an ac path between the telephone set and a terminating circuit. 3.22 four-wire transmission. A transmission method, circuit or system which provides separate paths (one pair each) for signals in the send and receive directions. 3.23 frequency response. Electrical, acoustic, or electroacoustic sensitivity (output/input), or gain, as a function of frequency. 3.24 head and torso simulator (HATS) for telephonometry. A manikin extending downward from the top of the head to the waist, designed to simulate the sound pick-up characteristics and acoustic diffraction produced by a median human adult and to reproduce the acoustic field generated by the human mouth. See ITU-T Recommendation P.58 (1996). 3.25 howling. Audible squealing sound in a telephone, handset or headset. Acoustic feedback, or oscillation, typically caused by too much acoustic coupling between the receiver and the microphone. 3.26 ideal codec. A codec that has theoretically optimum characteristics. 3.27 listener sidetone. The signal present at the receiver due to sound in the environment where the telephone is used. 3.28 loudness rating guard-ring position (LRGP). The test position a handset assumes when it is placed on an artificial test head as described in Annex A to ITU-T Recommendation P.76 [8]. 3.29 microphone. An electroacoustic transducer that converts sound to an electrical signal. 3.30 mouth reference point (MRP). A point on the axis of the mouth simulator, 25 mm in front of the center of the external plane. 3.31 overall. The direction of speech transmission from the mouth of one person to the ear of another person. Also called end-to-end. 3.32 overall loudness rating (OLR). A single-number value which corresponds to the perceived loudness loss of an overall connection, as specified in ITU-T Recommendation P.79 (1999). 3.33 pinna. The flexible part of the outer ear at the side of the head. 3.34 receive. The direction of speech transmission from the network to the ear of the telephone user. 3.35 receiver. An electroacoustic transducer that converts an electrical signal to sound and delivers it directly to the ear, sealed or unsealed. 3.36 reference codec. A codec that approaches the performance of an ideal codec and has superior, well-defined characteristics used for testing digital telephone sets. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 14 IEEE P269/D25 October 2004 640 641 642 643 644 645 646 647 648 649 650 651 652 653 654 655 656 657 658 659 660 661 662 663 664 665 666 667 668 669 670 671 672 673 674 675 676 677 678 679 680 681 682 683 684 685 686 687 688 689 690 691 692 693 694 3.37 receive loudness rating (RLR). A single-number value which corresponds to the perceived loudness loss of a receive connection, as specified in ITU-T Recommendation P.79 (1999). 3.38 reference receive volume control setting. The receive volume control setting of a telephone which results in the receive loudness rating (RLR) closest to the specified target value. 3.39 reference send gain control setting. The send gain control setting of a telephone which results in the send loudness rating (SLR) closest to the specified target value. 3.40 send. The direction of speech transmission from the mouth of the telephone user to the network. 3.41 send loudness rating (SLR). A single-number value which corresponds to the perceived loudness loss of a send connection, as specified in ITU-T Recommendation P.79 (1999). 3.42 sidetone. The direction of speech transmission from the microphone to the receiver of the handset or headset. There are two types of sidetone to be considered: listener sidetone and talker sidetone. 3.43 single frequency interference (SFI). An audible impairment that can be perceived as a tone relative to the overall noise level. . 3.44 sidetone masking rating (STMR). A single-number value which corresponds to the perceived loudness loss of the talker sidetone connection, as specified in ITU-T Recommendation P.79 (1999). 3.45 sound pressure level. The sound pressure level, in decibels, of a sound is 20 times the logarithm to the base 10 of the ratio of the pressure of the sound to the reference pressure. For this standard, the reference pressure is normally 1 pascal (Pa), and sound pressure levels are expressed in dB re 1 Pa (dBPa). When a reference pressure of 20 uPa is used, the sound pressure level will be expressed as dBSPL. Unless otherwise indicated, rms values of pressure are used. Most telephony acoustic measurements are referenced to 1 Pa (1 newton per square meter). However, measurements such as receive noise and room noise are generally referenced to 20 uPa. Note: 0 dB Pa 94 dBSPL, 0 dBSPL 20 micropascals, 1 Pa 1 N/m2. A-weighted sound pressure level in dB (dBSPL, A-weighted) is often abbreviated as dBA. (see ANSI S1.4-1983 (R 1997) ) 3.46 speaker (also loudspeaker). An electroacoustic transducer that converts an electrical signal to sound and delivers it to the ear from a distance of several centimeters or greater. 3.47 spectrum. A distribution of amplitude (or phase, or some other quantity) as a function of frequency. It is often expressed in bands. Bands may be of constant percentage width, such as 1/3 or 1/12th octave bands (~23% and ~6% of the center frequency, respectively). Bands may also be of fixed width, regardless of center frequency (e.g. 50 Hz). Instead of bands, a spectrum may also be expressed as spectrum density, which is equivalent to 1 Hz bands. 3.48 talker sidetone. The direction of speech transmission from mouth to ear of the telephone user. 3.49 telephone set. A device that, when connected to a telephone network, allows two-way voice communication. 3.50 test head. A fixture containing a mouth simulator and an ear simulator located in a specified relationship with each other. See loudness rating guard-ring position (3.28). 3.51 two-wire transmission. A transmission method, circuit, or system which provides common paths (one pair) for signals in the send and receive directions. 3.52 zero transmission level point (0 TLP). An arbitrarily established point relative to which transmission levels at all other points are specified. 695 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 15 IEEE P269/D25 October 2004 695 4 Abbreviations, Acronyms and Symbols 696 4.1 Abbreviations and acronyms 697 698 699 700 701 702 703 704 705 706 707 708 709 710 711 712 713 714 715 716 717 718 719 720 721 722 723 724 725 726 AGC ANTHD DFTP DRP DRTP DSP DTX ECRP EPD ERP ERUP FFT HATS LRGP MRP OLR RETP RLR RTP SETP SDN SFI SLR SNR STMR STP TDS THD VAD 727 4.2 728 729 730 731 732 733 734 735 736 737 738 739 740 741 Th el e t t e r“ G”i su s e df ors pe c t r a . Th i sc or r e s pon dst oc ommonus a g e ,e s pe c i ally in two-channel FFT analysis literature. The analysis bandwidth shall be specified: GDFTP(f) = rms spectrum at Diffuse Field Test Point, in dBPa GERP(f) = rms spectrum at Ear Reference Point, in dBPa GMRP(f) = rms spectrum at Mouth Reference Point, in dBPa G(MRP)(ERP)(f) = cross-spectrum between MRP and ERP, in dB (Pa/Pa) G(MRP)(SETP)(f) = cross-spectrum between MRP and SETP, in dB (V/Pa) GRETP (f) = rms spectrum at Receive Electrical Test Point, in dBV G(RETP)(ERP)(f) = cross-spectrum between RETP and ERP, in dB (Pa/V) G(RETP)(SETP)(f) = cross-spectrum RETP and SETP, in dB (V/V) GSETP(f) = rms spectrum at Send Electrical Test Point, in dBV GSETP(S+N)(f) = rms spectrum at SETP with both the mouth simulator and noise sources active, in dBV GSETP(N)(f) = rms spectrum at SETP with only the noise source active, in dBV automatic gain control amplitude normalized total harmonic distortion diffuse field test point drum reference point derived recommended test position digital signal processor discontinuous speech transmission ear cap reference point echo path delay ear reference point estimated real use position fast Fourier transform head and torso simulator loudness rating guard-ring position mouth reference point overall loudness rating receive electrical test point receive loudness rating recommended test position send electrical test point signal-to-distortion-and-noise ratio single frequency interference send loudness rating signal-to-noise ratio sidetone masking rating standard test position time delay spectrometry total harmonic distortion voice activity detector Symbols Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 16 IEEE P269/D25 October 2004 742 743 744 745 746 747 748 749 750 751 752 753 754 755 756 757 758 759 760 761 762 763 764 765 766 767 768 769 770 771 772 773 774 775 776 777 778 779 Th el e t t e r“ H”i su s e df orf r e qu e n c yr e s pon s e : H(f) = frequency response, in dB H’ ( f )= response at the new preferred ISO R10 frequency HEP(f) = echo path frequency response, in dB (V/V) HLS(f) = listener sidetone frequency response, in dB (Pa/Pa) HO(f) = overall frequency response, in dB (Pa/Pa) HR(f) = receive frequency response, in dB (Pa/V) HS(f) = send frequency response, in dB (V/Pa) HSD(f) = diffuse field send frequency response, in dB (V/Pa) HTS(f) = talker sidetone frequency response, in dB (Pa/Pa) Th el e t t e r“ L”i su s e df orr msl e v e l sme a s u r e dov e rawi deba n d,wi t ht h eba n dwi dt ht obes pe c i f i e d. Th i s corresponds to common usage in sound level measurements, as specified in ANSI S1.1-1994: LERP = level at Ear Reference Point, in dBPa LMID = level of stimulus to be determined for headset tests (see 9.3.2) LMRP = level at Mouth Reference Point, in dBPa LRETP = level at Receive Electrical Test Point, in dBV or dBm LROOM = level of background noise in measurement environment, in dBSPL LSETP = level at Send Electrical Test Point, in dBV or dBm Th el e t t e r“ S”i su s e df ors pe c i a l l yc a l c u l a t e ds e ns i t i v i t i e s : SDE = translation from HATS Drum Reference Point to Ear Reference Point Th el e t t e r“ T”i su s e df ort i meme a s u r e me n t s : T = length of time window in simulated free-field techniques, in sec TC = convergence time of acoustic echo cancellers (AEC) algorithm, in sec “ TCL”i sus e df orTe r mi n a lCou pl i ngLos s : ATCLT = active temporally weighted terminal coupling loss, in dB ALTCLT = active long-term temporally weighted terminal coupling loss, in dB LTCLT = long-term temporally weighted terminal coupling loss, in dB TCL = terminal coupling loss, in dB TCLT = temporally weighted terminal coupling loss, in dB TCLW = frequency weighted terminal coupling loss, in dB Other symbols: SendSNR = send signal-to-noise ratio, in dB SendSNRW = weighted send signal-to-noise ratio, in dB 780 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 17 IEEE P269/D25 October 2004 780 781 782 783 784 785 786 787 788 789 5 Test Equipment and Setup Test equipment generally required to test all the devices covered by this standard is covered in this clause. The specific test equipment required to produce test signals and analyze the resulting output is determined by the test signal and analysis method chosen. Test circuits, interfaces and impairments for analog and digital telephones, as well as 4-wire devices such as handsets and headsets, are described in Clauses 7, 8, and 9 respectively. All equipment should be calibrated in accordance with the recommendations of the manufacturer before performing the system calibration procedures in Clause 6. 790 5.1 Ear simulators 791 792 793 794 795 The fundamental purpose of ear simulators is to test a receiver under conditions that most closely approximate actual use by real persons. The recommendations that follow are based upon the manner in which the receivers are intended to be used. Modifications to an ear simulator or test procedure shall not be made. For example, flexible sealing material, such as putty, shall not be used. 796 5.1.1 797 798 799 800 801 802 803 804 805 806 807 808 809 810 811 812 813 814 815 816 817 818 819 820 An ear simulator with a flexible pinna shall be used for all measurements, unless the applicable performance specification requires or allows an alternative. In this case the requirements of Annex B shall be met. The Type 3.3 ear simulator is recommended for all devices. The Type 3.4 ear simulator is recommended for all devices except supra-concha headsets, supra-aural headsets and intra-concha headsets with acoustic outlets that do not face the ear canal. 821 5.1.2 822 823 824 825 826 827 Type 3.3 and Type 3.4 ear simulators both simulate the acoustical and mechanical characteristics of real ears. They are likely to give results comparable to the typical listening experience of real persons for the widest possible variety of headsets. However, the correlation between measurements on ear simulators and on real ears is better for some headset types than others. For headsets that are in close proximity to, or in the ear canal, the correlation is not as good as for most other types. Selection The ear simulators shall comply with the specifications given in ITU-T Recommendation P.57-2002, except for Type 3.3. Type 3.3. shall have a hardness of 35 ±3 degrees Shore-OO, as measured according to ASTM 2240. (ITUT Recommendation P.57-2002 specifies a hardness of 55 ±10 degrees Shore-OO for Type 3.3.) Type 3.3 and Type 3.4 ear simulators both simulate the acoustical and mechanical characteristics of real ears. They are likely to give results comparable to the typical listening experience of real persons for the widest possible variety of handsets or headsets and applications, including non-traditional designer handsets and headsets. Both types simulate typical leakage and how it changes with position and/or applied force. There are, however, some differences between the two types, as well as the positioning devices available for use with them. For more information, please see Annex A. (Type 3.3 was formerly called the soft HATS pinna. It has a hardness of 55, ±10 degrees Shore-OO, as measured according to ASTM 2240. It is an anatomically-shaped pinna which is structurally identical to the pinna formerly described as Type 3.3 in ITU-T Recommendation P.57.) The same ear simulator shall be used for all measurements on a particular device. The choice of ear simulator and positioning method shall be clearly stated in all test reports. Headset measurements made on ear simulators compared to real ears Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 18 IEEE P269/D25 October 2004 828 829 830 831 For insert headsets, both Type 3.3 and Type 3.4 ear simulators are likely to provide a greater seal than on many human subjects, resulting in an overestimation of output at low frequencies. Nonetheless, both ear simulators are recommended for this application. 832 5.1.3 833 834 835 836 837 838 839 840 841 842 843 844 845 846 847 848 849 Type 3.3 and Type 3.4 ear simulators both measure at the eardrum reference point (DRP). Measurements collected at the DRP shall be translated to the ERP. This is done because receive and sidetone specifications are referenced to the ERP. It also permits comparison of measurements made on the various type ear simulators. 850 5.2 851 852 853 854 855 856 857 858 859 860 861 862 863 The fundamental purpose of mouth simulators is to test a microphone under conditions that most closely approximate actual use by real persons. The mouth simulator shall comply with the specifications given in ITU-T Recommendation P.58, unless the applicable performance specification requires or allows an alternative. See Annex B. This mouth is generally installed in a HATS. 864 5.3 865 866 867 The fundamental purpose of test fixtures is to test a device equipped with a handset or headset under conditions that most closely approximate actual use by real persons. 868 5.3.1 869 870 871 872 873 874 875 876 The test fixture shall be a HATS which complies with ITU-T Recommendation P.58. When using the Type 3.3 ear simulator, the HATS shall also comply with ITU-T Recommendation P.64, Annex E. When using the Type 3.4 ear simulator, the HATS shall also comply with ITU-T Recommendation P.64, Annex D. Translation from DRP to ERP For all measurements, the translation from DRP to ERP may be fulfilled by using a filter as specified in Annex C. A filter shall be used for measurements of peak acoustic pressure, and is recommended for measurements of distortion. For measurements made with any kind of spectrum analysis, the translation from DRP to ERP may be performed by using one of the tables in Annex C. Measurement examples include frequency response, noise, linearity and distortion. Tables may also be used for frequency response measurements made with sine waves, if only the fundamental or total response is included. For measurements of distortion using a sine or narrowband stimulus, a translation table may be constructed based on one of the tables in Annex C. Separate tables are required for each harmonic or difference-frequency distortion product, taking into account the frequency offset between the stimulus frequency and the frequency of the distortion product. Mouth simulators ITU-T Recommendation P.58 does not define a sound field behind the lip plane of the mouth simulator. However, experience has shown that at least one implementation of the mouth has a sound field distribution which closely approximates the sound field behind the lip plane of a real human head, up to at least 4 kHz. The investigated region extends from behind the lip plane to the base of the rubber ear and equal to or greater than 5 mm above the surface of the HATS cheek. This makes HATS suitable for testing headsets, cordless and cellular phones, handsfree phones, and traditional corded handsets. The sound field approximation may extend in frequency range as well as to other regions around HATS, but these have not yet been verified. Test Fixtures Selection The LRGP position was specified in previous editions of this standard. Send frequency response measurements made on ordinary telephones from 300-3400 Hz are expected to give practically identical results, whether obtained with LRGP or the HATS position. Systematic differences of about 1-2 dB in send frequency response measurements on pressure gradient microphones have to be expected from the upwards tilted speaking direction of about 19 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 19 IEEE P269/D25 October 2004 877 878 879 880 881 882 degrees using the LRGP position. See ITU-T Recommendation P.64 (1999), Annex F. (Similar effects might be observed in sidetone and overall measurements.) 883 5.3.2 884 885 886 887 888 The two alternatives for handset positioning are the standard test position (STP) and the manufacturer’ s recommended test position (RTP). STP is defined in clause 5.3.2.1 and RTP is defined in clause 5.3.2.2. STP shall be used unless an RTP is defined by the manufacturer. 889 5.3.2.1 890 891 892 893 894 895 896 897 898 899 900 901 902 903 904 905 906 907 908 909 910 911 912 913 914 915 916 917 918 919 920 921 922 923 924 925 926 927 928 929 The handset receiver must be nominally placed in the HATS position as specified by Annex D or E of ITU-T Recommendation P.64. To do this, the ear-cap reference point (ECRP) must lie on the axis of motion of the positioning device. This axis is defined by a line that passes through the ERP of the left and right ears. The ECRP may be inside of or outside of ERP depending on the applied force and the shape of the receiver. For information about an alternative test fixture, and the ear simulators and mouth simulator with which it can be used, see Annex B. Handset positioning Standard test position (STP) For STP, the handset receiver must be nominally placed in the HATS position as specified by Annex D or E of ITUT Recommendation P.64. To do this, the ear-cap reference point (ECRP) must lie on the axis of motion of the positioning device. This axis (X axis) is defined by a line that passes through the ERP of the left and right ears. The ECRP may be inside of or outside of ERP depending on the applied force and the shape of the receiver. For the purposes of this standard, the ECRP is the intersection of the external ear-cap reference plane with a normal axis through the effective acoustic center of the sound outlet ports. Generally, the acoustic center of the sound outlet ports is at the center of their distribution. Unless otherwise specified by the manufacturer, the ECRP is the intersection of the external ear-cap reference plane (ECRP Plane) with a normal axis (X axis as defined by ITU-T P.64, Annex E) through the effective acoustic center of the sound outlet ports. Generally, the acoustic center of the sound outlet ports is at the center of their distribution. For many handsets, the ECRP plane is parallel to the reference plane of the positioning device. For many handsets, the ear-cap reference plane is parallel to the reference plane of the positioning device. For some handsets, the above positioning may not apply, and the position that best represents intended use shall be utilized. The receiver shall contact the pinna with a force of 6 newtons. This is the default force for all measurements. In general, it is desirable that receive frequency response should not change too much as application force changes. For this reason, the device should also be tested at 2N and 10N, which represent minimum and maximum forces likely to be used by real persons on a long-term basis. These results are for information, but do not have to be included in the test report. In general, it is desirable to know how the receive frequency response and loudness rating change as application force changes. For this reason, the device shall be tested at a high leak position and a low leak position, which represent minimumtypical and maximum forces likely to be used by real persons on a long-term basis. All tests shall be performed at the high leak position as defined below: 1. For the Type 3.3 artificial ear the receiver shall be located at the ERP. 2. For the Type 3.4 artificial ear the receiver shall be applied with a force of 6 N. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 20 IEEE P269/D25 October 2004 930 931 932 The tests in Table ?? shall also be performed at the low leak position. Test type Receive Send Sidetone Echo Max Acoustic Output 933 934 935 936 937 938 939 940 941 942 Analog 7.4.1 7.5.1 7.6.1, 7.6.2 7.10 Digital 8.4.1 8.5.1 8.6.1, 8.6.2 8.8, 8.9 8.13 4-Wire Handsets 9.3.3 9.4.2 9.5 9.6 The low leak position is defined below: 1. For the Type 3.3 artificial ear the receiver shall contact the pinna with a force of 18 N 2. For the Type 3.4 artificial ear the receiver shall contact the pinna with a force of 15 N. Maximum acoustic output (clauses 7.10, 8.13 and 9.6) shall be tested at both high leak and low leak position. The f i n a lr e s ul ts h a l lbea n“ u ppe re n v e l ope ”c u r v ec on s i s t i n goft h ema xi mum ou t pu tofe a c hme a s u r e me n ta te a c h frequency. See Figure 3Figure 3Figure 3 and Figure 4Figure 4Figure 4. 130 L ERP(f) dB 120 110 100 90 100 943 944 945 946 947 1000 10000 Frequency (H z) Figure 1 Maximum Acoustic Output, LERP(f), 2 measurements on one handset Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 21 IEEE P269/D25 October 2004 130 L ERP(f) dB 120 110 100 90 100 1000 10000 Frequency (H z) 948 949 950 951 952 953 954 955 Figure 2 Maximum Acoustic Output, LERP(f). Upper envelope (heavy line) and 2 individual measurements on one handset (light lines). 956 5.3.2.2 Recommended Test Position (RTP) 957 958 959 960 961 962 963 964 965 966 967 968 969 970 971 972 973 974 975 976 977 978 979 980 981 982 983 984 985 A manufacturer may specify a recommended test position (RTP) on either the Type 3.3 or Type 3.4 or both ear simulators. The force applied shall not exceed 18N for Type 3.3, and 15N for Type 3.4. The definition of the RTP, including evidence of its authorization by the device manufacturer, shall be included in the test report. RTP is defined in following steps: 1. Find ECRP on the handset. Unless otherwise specified by the manufacturer, the ECRP is the intersection of the external ear-cap reference plane (ECRP Plane) with a normal axis (X axis as defined by ITU-T P.64, Annex E) through the effective acoustic center of the sound outlet ports. Generally, the acoustic center of the sound outlet ports is at the center of their distribution. For many handsets, the ECRP plane is parallel to the reference plane of the positioning device. 2. Line up ECRP at Ear simulator ERP on the positioning device. The ECRP plane shall be identical to the plane of the ERP as defined by the positioning device. 3. Move ECRP in ECRP plane (Ear cap reference plane) relative to ERP. This can be defined as (Y, Z) coordinates (ITU-T P.64, Annex E) in the ECRP plane. If none given, leave the ECRP centered on ERP, equivalent to (0, 0) coordinates. The Y axis is defined along the length of the phone with positive Y being i nadi r e c t i ont owa r dst h emi c r oph on ef r omECRP( mov i ngt h eph on e“ down ”ont h epos i t i on e r ) .Th eZ axis intersects at ECRP, and is perpendicular to the Y axis, with positive Z being towards the right as the ph on ei sobs e r v e df r omt h ef r on t( mov i ngt h eph on et ot h e“ r i g h t ”onpos i t i on e r )( de f i n e don l yf orr i g h t ear). 4. Adjust the three angles as defined for device under test (angles A, B, C, which are rotated about three mutually perpendicular axis originating at ERP for a given positioner type). If none given, use angles consistent with HATS position which shall be defined by the handset positioner equipment manufacturer. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 22 IEEE P269/D25 October 2004 986 987 988 989 990 991 992 993 994 995 996 997 998 999 1000 1001 1002 1003 1004 1005 1006 1007 1008 1009 1010 1011 5. Adjust pressure or distance along ECRP axis (vector in X direction) to given force setting or X coordinate. State the force or X coordinate used. If none given, use 6N. Regardless of force specified for RTP, the device should also be tested at 6N. 6. RTP can then be defined as the combination (Y, Z) coordinates, three angles and force or X coordinate. The manufacturer of the device under test is responsible for providing this data. All tests shall be performed at the RTP. Maximum acoustic output (clauses 7.10, 8.13 and 9.6) shall be tested at 6 N as well as the force or X coordinate defined by RTP. (One could experience a force of approximately 10N by placing a weight of 1 Kg on top of a lightweight receiver placed on his or her pinna, with the ear cap reference plane horizontal.) A manufacturer may specify a recommended test position (RTP) on either the Type 3.3 or Type 3.4 ear simulator. The RTP may specify position with respect to ERP, a specific force, or other aspects of the test position intended to simulate actual use. The force applied shall not exceed the range of 2-10N. If the phone is tested at the RTP, the definition of the RTP, including evidence of its authorization by the device manufacturer, shall be included in the test report. If the RTP is used, the device should also be tested at 2N, 6N and 10N on the same ear simulator. These results are for information, but do not have to be included in the test report. For maximum acoustic output measurements, the device shall be tested at either 6N or the RTP, and also at 13N. Th ef i n a lr e s u l ts h a l lbea n“ uppe re n v e l ope ”c u r v ec on s i s t i n goft h ema x i mum ou t pu tofe a c hme a s u r e me n ta te a c h frequency. See Figure 3Figure 3Figure 3 and Figure 4Figure 4Figure 4. 130 L ERP(f) dB 120 110 100 90 100 1012 1013 1014 1015 1016 1000 10000 Frequency (H z) Figure 3 Maximum Acoustic Output, LERP(f), 2 measurements on one handset Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 23 IEEE P269/D25 October 2004 130 L ERP(f) dB 120 110 100 90 100 1000 10000 Frequency (H z) 1017 1018 1019 1020 1021 1022 1023 1024 1025 1026 1027 Except for maximum acoustic output, the same positioning shall be used for all measurements of any particular device. The positioning method shall be clearly stated in the test report. 1028 5.3.3 1029 1030 1031 1032 1033 1034 1035 1036 1037 1038 1039 1040 1041 1042 1043 1044 1045 1046 1047 1048 1049 1050 1051 1052 1053 1054 For a given headset placement, the same position shall be used to test all the electro-acoustic parameters. Figure 4 Maximum Acoustic Output, LERP(f). Upper envelope (heavy line) and 2 individual measurements on one handset (light lines). Handsets with carbon microphones require conditioning procedures before positioning for measurement. See Annex D. Headset positioning a) RTP: If the manufacturer specifies a recommended test position (RTP), the headset shall be tested in that position. The RTP shall reflect the way the headset is intended by the manufacturer to be used in a real situation. The manufacturer should provide suitable pictures to illustrate the RTP. b) DRTP: I ft h ema nu f a c t u r e r ’ sRTPi sn otpr ov i de d,bu tt h e r ei sar e c omme n de dwe a r i ngpos i t i on( RWP) pr ov i de di nt h eus e r ’ sgu i de ,t h e na nRTPs h a l lbede r i v e df r om t h eRWPa n du s e d.I ts ha l lbec a l l e dt h e derived recommended test position (DRTP). c) ERUP: I ft h ema nuf a c t u r e r ’ sRTPa n dRWPa r en otpr o v i de d,t h e nt h eh e a ds e ts h a l lbet e s t e di nt h e estimated real use position (ERUP). The test lab shall define an ERUP that closely approximates real use. Natural headband pressure, or other positioning techniques normally used by a real person, shall be used. The test position shall define how the receiving part of the headset is to be placed against or inside the ear simulator. After providing receiver placement instructions, the test position shall then describe the subsequent positioning and orientation of the microphone. The exact positioning of the microphone shall be specified using geometric coordinates relative to centre of lips using three axes (See ITU-T Rec. P.64): a) The Xm axis coincides with the mouth reference axis and has positive direction into the mouth. b) The Ym axis is horizontal, perpendicular to the Xm axis with positive direction towards the right side of the head. c) The Zm axis is perpendicular to the Xm axis and Ym axis with positive direction upwards. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 24 IEEE P269/D25 October 2004 1055 1056 1057 1058 1059 1060 1061 1062 1063 1064 1065 1066 1067 1068 1069 1070 1071 1072 1073 1074 1075 1076 1077 1078 1079 1080 1081 1082 1083 1084 1085 1086 1087 1088 1089 1090 1091 The closer the microphone is to the mouth, the more sensitive the results will be to any inaccuracy of the geometrical positioning. Pressure gradient microphones (cardioid, noise canceling, etc.) are especially sensitive to both position and orientation. The recommended orientation of the microphone towards the mouth shall be stated. For headsets that are fixed at the ear, and have a short microphone boom configuration, then the receiver coupling provides the main positioning element, with the boom pointed at MRP. 1092 5.3.3.15.3.4 1093 1094 1095 1096 1097 1098 1099 1100 1101 1102 1103 1104 1105 1106 1107 1108 When a headset is placed on the Type 3.3 or Type 3.4 ear simulatorHATS, the receiver test results may vary from trial to trial due to slight variations in positioning. Relatively accurate and repeatable results can be obtained by making several measurements and averaging the results. The procedures in this clause shall be followed for send, receive, sidetone and overall measurements. When positioning a headset on a HATS, it is generally possible to approximate real use in an obvious way. In any case where the headset does not fit on the HATS and its ear simulator quite in the way intended for real persons, adjustments may be made so the receiver and microphone are as close as possible to positions corresponding to real use. Particular caution should be excercised when positioning receivers (such as earbuds) near or in the ear canal, as they are subject to more variation than other receiver types. The body of the receiver, the headband or any other non-acoustical component may be positioned as necessary. Jigs may be used to improve repeatability of postioning provided that they do not cause any acoustic impairment to the measurement. The test operator should become acquainted with the specific headset by running some preliminary learning tests. The final positioning used should be documented with pictures. Closeups of both send and receive positioning are strongly recommended. Headsets should be tested in a position that most closely approximates real use. Natural headband pressure, or other positioning techniques normally used by a real person, shall be used for testing. If the manufacturer specifies a recommended test position (RTP), the headset shall be tested in that position. The purpose of the RTP shall be to clarify how to position the headset in a way that corresponds to real use. The RTP shall be defined geometrically with respect to the MRP, center of the lip plane, ERP, ear entrance point (EEP) and/or the HATS reference point (HRP). See ITU-T Recommendation P.58. Facial features, such as the corner of the mouth, shall not be used as reference points. If no RTP is specified, the test position can be determined by observing the actual design of the headset and by following any guidelines for positioning provided by the manufacturer. When positioning a headset on a HATS, it is generally possible to approximate real use in an obvious way. In any case where the headset does not fit on the HATS and its ear simulator quite in the way intended for real persons, adjustments may be made so the receiver and microphone are as close as possible to positions corresponding to real use. The body of the receiver, the headband or any other non-acoustical component may be positioned as necessary. Headset receiver positioningmeasurement repeatability and averaging A minimum of 5 measurements of frequency response and loudness rating shall be made on each individual unit tested. The headset shall be completely removed from the ear simulator and re-mounted for each trial. The mean and standard deviation of the loudness rating and each point of the frequency response shall be computed for this group of measurement trials. The accuracy of the final results shall be considered acceptable if the standard deviation of the measurements meet the following criteria: For receive, the standard deviation of loudness rating isshall be 1 dB or less, and if the standard deviation of the frequency response shall beis 2 dB or less from 200 to 14000 Hz, and 1 dB or less from 1000 through 4000 Hz. For send, the standard deviation of loudness rating shall be 1 dB or less, and the standard deviation of the frequency response shall be 1 dB or less from 200 to 4000 Hz. If the results of the first 5 trials do not meet this criteriathese criteria, report the results, but label them as reduced accuracy. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 25 IEEE P269/D25 October 2004 1109 1110 1111 1112 1113 1114 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 1127 1128 For sidetone, the standard deviation will likely be wider than either send or receive. The standard deviation of the loudness ratings and frequency response measurements shall be reported. The reported results shall include the mean loudness rating and standard deviation, the mean frequency response and standard deviation, a description of the test position, and the number of trials. Additional measurements may be made in order to meet the mean and standard deviation criteria. Similarly, a minimum of 5 measurements of distortion shall be made, and the mean shall be reported. A minimum of 5 measurements of all other parameters should also be made, and the mean reported. The mean results shall be reported. For maximum acoustic output measurements made using the Type 3.3 or Type 3.4 ear simulator, at least 5 me a s u r e me n t ss h a l lbema de .Th ef i n a lr e s u l ts h a l lbea n“ uppe re n v e l ope ”c u r v ec on s i s t i n goft h ema x i mum output of each measurement at each frequency. All curves shall be reported, for a total of at least 5 individual measurements plus the upper envelope curve. See the example in Figure 5Figure 5Figure 5 and Figure 6Figure 6Figure 6. 130 L ERP(f) dB 120 110 100 90 100 1129 1130 1131 1000 10000 Frequency (H z) Figure 5 Maximum Acoustic Output, LERP(f), 5 measurements on one receiver Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 26 IEEE P269/D25 October 2004 130 L ERP(f) dB 120 110 100 90 100 1132 1133 1134 1135 1136 1137 1138 1139 1000 10000 Frequency (Hz) Figure 6 Maximum Acoustic Output, LERP(f). Upper envelope (heavy line) and 5 individual measurements on one receiver (light lines). For headsets with large hard-cap receivers which are similar to receivers in handsets, Clause 5.3.2 may apply. 1140 5.3.3.2Headset microphone positioning 1141 1142 1143 1144 1145 1146 1147 1148 1149 1150 1151 1152 1153 1154 1155 1156 Three test positions are defined for the location of the headset microphone sound port, in order of preference. 1157 5.4 1158 1159 1160 1161 The sizes and types of measurement microphones are specified in the clauses where their use is required. All microphones used to implement this standard shall comply with the relevant specifications in ANSI S1.12-1967 (Reaff. 1997). 1162 5.5 1163 1164 Electroacoustic measurements should be conducted in a test environment that will not affect the results beyond the intended influence of the test fixture and measurement transducers. The test environment should have a low a)Recommended test position (RTP). b)Boom microphone position (BMP). If an RTP is not provided, the BMP may be used if it corresponds to the intended usage of the microphone. The BMP is defined in clause 3.6 and in ITU-T Recommendation P.58. c)Estimated real use position. These positions may fall behind the lip plane of the mouth. Please see clause B.2 for more information. Pressure gradient microphones (cardioid, noise canceling etc.) are sensitive to both position and orientation. It is important that the correct orientation be used to obtain results representing actual use performance. For microphones that are not measured at RTP or BMP, or are not on a fixed boom, state the exact geometric test position following the guidelines in clause 5.3.3. Measurement microphones Test environment Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 27 IEEE P269/D25 October 2004 1165 1166 1167 1168 1169 1170 background noise level, and the test fixtures and device under test should be isolated from reflections and mechanical disturbances that could cause significant error. 1171 5.5.1 1172 1173 1174 1175 1176 1177 1178 1179 The background noise level in the test environment shall not exceed the limits shown in Table 1Table 1Table 1. The overall level shall not exceed 29 dBA. However, these limits may be relaxed if it can be shown that the accuracy of the measurement is not impaired. Be sure to record the test environmental conditions of temperature, humidity, and barometric pressure, in addition to the background noise. Overall A-weighted noise level and octave band sound levels are defined below. Background noise level Background noise measurements shall be made using a 12.5mm pressure microphone with a microphone system noise level not exceeding 20 dBA. The individual factory-calibrated frequency response of the microphone, if available, shall be taken into account. Octave Band Center Frequency (Hz) 63 125 250 500 1000 2000 4000 8000 1180 1181 1182 Octave Band Level (dBSPL) 49 34 29 29 29 29 29 29 Table 1 Test room noise levels 1183 5.5.2 Reflection-free conditions 1184 1185 1186 1187 The test environment should be sufficiently free of reflections. There should be no large objects within 1m of the MRP. Small objects such as tripods that are used for positioning may be acceptable. Errors due to the influence of reflections shall not exceed ± 1.5 dB below 800 Hz. Errors above 800 Hz shall not exceed ± 1.0 dB. 1188 5.5.3 1189 1190 1191 1192 1193 1194 1195 1196 1197 1198 1199 1200 1201 1202 1203 1204 A uniform diffuse sound field shall exist in a volume of radius 0.15 m. The diffuse field test point (DFTP) is at the center of this spherical volume. There shall be no obstacles, including the loudspeakers, within 0.5m of the DFTP. Diffuse field conditions The classical method of creating a diffuse field is to construct a reverberation chamber. If one is available, it is generally the best method. (Construction and verification of a reverberation room is outside the scope of this standard.) For the purposes of this standard, a diffuse field may be approximated by using several loudspeakers and uncorrelated noise sources. Experience has shown that 4-8 speakers and uncorrelated sources in an ordinary room may be sufficient for measurements in 1/3 octaves. However, more may be required, especially if measurements are to be made in 1/12 octave resolution. Diffuse field measurement should be made using a 6.25 mm pressure microphone, but may also be made using a 12.5 mm random pressure microphone. The individual factory-calibrated frequency response of the microphone, if available, shall be taken into account. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 28 IEEE P269/D25 October 2004 1205 1206 1207 1208 Diffuse field conditions shall be verified by the following two tests, performed in the same resolution and bandwidth used for measurements. The test is performed with reference to the DFTP, with no mouth simulator or other objects present. 1209 5.5.3.1 1210 1211 1212 1213 1214 1215 1216 1217 1218 Diffuse field conditions at the DFTP shall be verified by measurements with a cardioid or bi-directional microphone with a free field rejection of at least 10 dB front-to-back (cardioid) or front-to-side (bi-directional) in each frequency band. The sound field shall be considered to approximate a diffuse (random-incidence) field if the variation is within the tolerance in Table 2Table 2Table 2. The microphone is rotated about the DFTP through 360 degrees in each of three perpendicular planes. Measurement must be made in 15 degree increments or less. Since microphone rejection may not be the same in all bands, the tolerance for each band shall be determined by the microphone rejection in that particular band. Test for diffuse field Microphone rejection at least 25 dB or greater 20 dB 15 dB 10 dB Less than 10 dB 1219 1220 1221 1222 Allowable variation over 360 degrees 6 dB 5 dB 4 dB 3 dB Microphone not suitable Table 2 Diffuse field variation allowable vs microphone rejection 1223 5.5.3.2 Test for spectrum uniformity 1224 1225 1226 1227 1228 1229 GDFTP (f) (the spectrum at DFTP) shall be measured at the DFTP and 6 additional points +/- 15cm from DFTP on each of three mutually perpendicular axes passing through the DFTP. The spectrum at these 6 points shall not vary from GDFTP (f) by more than +/- 3 dB in each band. 1230 5.6 1231 1232 1233 1234 1235 In order to test a telephone, handset or headset realistically, it may be useful to test it in environments similar to those in which it is expected to operate. Such environments can be considered acoustic impairments, which may cause the telephone to work differently than in a quiet test space. Two such impairments are described in this clause, but others may also be relevant for some applications. 1236 5.6.1 1237 1238 1239 1240 1241 1242 1243 The reference corner is one physical setup used for echo, howling and stability tests. The reference corner consists of three perpendicular plane, smooth, hard surfaces 0.5 m square, as shown in Figure 7Figure 7Figure 7. A handset shall be placed along the diagonal from the apex of the reference corner to the outside corner, with the earcap end of the handset 250 mm from the apex. A headset is placed on the surface as if it was put down briefly by a user, with the receiver 250 mm from the apex. Calibration of the diffuse field shall be according to 6.7.1 and 6.7.2, except performed at the DFTP. Acoustic impairments Reference corner Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 29 IEEE P269/D25 October 2004 250 mm 500 mm 1244 1245 1246 1247 Figure 7 –Reference corner for echo, howling and stability tests 1248 5.6.2 Hoth room noise 1249 1250 Hoth noise is random acoustic noise which has a spectrum designed to simulate typical ambient room noise. See Annex E for details. The noise level shall be specified in dBA. 1251 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 30 IEEE P269/D25 October 2004 1251 6 Calibration 1252 6.1 1253 1254 1255 1256 All equipment shall be calibrated according to the manuf a c t u r e r ’ sr e c omme n da t i on sa ndi na c c or da n c ewi t hg ood laboratory practice. Be sure that all equipment has been powered up long enough to be stable before calibration, typically 30 minutes. 1257 6.2 1258 1259 Analyzers and level meters shall be calibrated to an accuracy of at least 0.5 dB. 1260 6.3 1261 1262 1263 1264 1265 The sensitivity of measurement microphones shall be calibrated prior to each use, to an accuracy of at least 0.5 dB. An acoustical calibrator with an accuracy of at least 0.2 dB shall be used. 1266 6.4 1267 1268 1269 1270 1271 The sensitivity of the ear simulator should be calibrated each day the system is in use. For best accuracy, it should be calibrated prior to measurements on each new device. An acoustical calibrator with an accuracy of at least 0.2 dB shall be used, along with the factory-supplied adapters for the ear simulator to be calibrated. Be sure to apply any correction factor required for any particular combination of calibrator, adapter and ear simulator. 1272 6.5 1273 1274 1275 1276 1277 1278 1279 1280 1281 The calibration procedures shall be performed using the same format as will be used for measurements. Format examples are 1/N octave bandwidth analysis, constant bandwidth analysis and R-series preferred frequencies. Bandwidth shall be the same as or greater than that which will be used for measurements. Resolution shall be the same as or finer than that which will be used for measurements. Amplitude accuracy shall be the same as or better than that which will be used for measurements. The actual format, bandwidth, resolution and amplitude accuracy shall be stated. See Annex F for additional details. Also, review clauses F.9, F.11 and G.6 and G.7 for a summary of the test signal parameters, comparison of test methods and signals, and details about measurement bandwidth and resolution. 1282 6.6 1283 1284 1285 1286 1287 1288 1289 1290 1291 1292 Electrical test signals should be calibrated each day the system is in use. For best accuracy, they should be calibrated prior to measurements of each new device. The analyzer or level meters used shall be calibrated first (6.2). General Electrical measurement instruments Measurement microphones The individual factory-calibrated frequency response, if available, shall be taken into account. Ear simulator Measurement bandwidth and resolution Electrical test signals Electrical test signals shall be applied from a 900 ohm resistive source impedance for most analog telephones, and a 600 ohm resistive source impedance for digital telephones. These calibrations are performed across matched calibrated resistive loads. As a result, receive and echo test signals are specified under nominally loaded conditions. This is equivalent to one-half the open-circuit voltage. Following a calibration, the resistive load is removed and the source is connected to RETP without further adjustment. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 31 IEEE P269/D25 October 2004 1293 1294 1295 A similar calibration is required for testing handset and headset 4-wire devices. See clause 9.2 for the source impedance requirements. 1296 6.6.1 1297 1298 1299 1300 1301 1302 1303 1304 1305 The electrical test spectrum is measured across a calibrated resistive load. For sinusoidal test signals, the spectrum shall be flat within ± 0.5 dB over the actual measurement bandwidth. Equalization may be used to meet this requirement. 1306 6.6.2 1307 1308 1309 1310 1311 1312 1313 1314 1315 1316 1317 1318 1319 1320 1321 1322 1323 The standard electrical test level, nominal LRETP, is -16 dBV rms, 0.5 dB, for analog telephones. This test level is recommended for measurements at minimum and reference volume control settings, and -30 dBV is recommended at maximum volume. Total harmonic distortion shall be less than 1% for these test conditions. 1324 6.7 1325 1326 1327 1328 The mouth simulator should be calibrated each day the system is in use. For best accuracy, it should be calibrated prior to measurements on each new device. The measurement microphone used to calibrate the mouth simulator shall be calibrated first (6.3). 1329 6.7.1 1330 1331 1332 1333 1334 1335 1336 1337 1338 The acoustic test spectrum is measured at the Mouth Reference Point (MRP). For sinusoidal test signals, the spectrum shall be flat within 0.5 dB over the actual measurement bandwidth. Equalization may be used to meet this requirement. Electrical test spectrum For all other test signals, the electrical spectrum shall meet the target spectrum and spectrum tolerance for the type of signal used, as defined in Annex F. If no tolerance is specified in the signal definition, the default tolerance is ± 3 dB from 175 - 4500 Hz (or the 1/3 octave bands from 200 - 4000 Hz), and +3/-5 dB elsewhere. Equalization may be used to meet this requirement. Electrical test level The standard test level for digital telephones, nominal LRETP, is –18.2 dBV, 0.5 dB, for a 600 ohm interface. This corresponds to – 16 dBm0. This test level is recommended for measurements at minimum and reference volume control settings. For measurements at maximum volume control settings, LRETP is -32.2 dBV. This corresponds to – 30 dBm0. Total harmonic distortion of the test signal shall be less than 1% for these test conditions. The standard test level for handsets and headsets tested as 4-wire devices is determined by the procedure for setting the default receive volume control adjustment in clause 9.3.2. For sinusoidal test signals, the level shall be held constant at all test frequencies. For continuous spectrum test signals, the level shall be measured over the entire spectrum. Out-of-band signals from 40 to 20,000 Hz shall add no more than 0.5 dB to this level. Mouth simulator Acoustic test spectrum For all other test signals, the acoustic spectrum shall meet the target spectrum and spectrum tolerance for the type of signal used, as defined in Annex F. If no tolerance is specified in the signal definition, the default tolerance is 3 dB from 175 - 4500 Hz (or the 1/3 octave bands from 200 - 4000 Hz), and +3/-5 dB elsewhere. Equalization may be used to meet this requirement. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 32 IEEE P269/D25 October 2004 1339 6.7.2 Acoustic test level 1340 1341 1342 1343 1344 1345 1346 1347 The standard acoustic test level for send, LMRP, is -4.7 dBPa rms, 0.5 dB, at the MRP. Total harmonic distortion of the mouth simulator shall be less than 2% for this test condition. 1348 6.7.3 1349 1350 1351 1352 A 6.25mm pressure or free-field microphone shall be used to calibrate the HATS mouth simulator. The microphone axis shall be oriented 90 degrees to the mouth axis with the center of the protection grid at the MRP (see Figure 8Figure 8Figure 8). (The HATS manufacturer generally supplies a jig for this purpose.) For sinusoidal test signals, the level at MRP shall be held constant at all test frequencies. For continuous spectrum test signals, the level shall be measured over the entire spectrum. Out-of-band signals from 40 to 20,000 Hz shall add no more than 0.5 dB to this level. Mouth simulator calibration procedure Equivalent Lip-Plane Mouth Axis Microphone 25mm HATS 1353 1354 1355 1356 1357 1358 1359 1360 1361 1362 1363 1364 1365 1366 1367 1368 1369 1370 1371 1372 Figure 8 HATS Mouth Calibration If a pressure microphone is used, the results may be used directly. The individual factory-calibrated frequency response of the microphone, if available, shall be taken into account. If a free-field microphone is used, the free-field correction curve for 90 degrees shall be taken into account, and the individual factory-calibrated frequency response of the microphone, if available, shall be taken into account. To calibrate the mouth, measure GMRP(f), the spectrum at the MRP. Adjust the mouth equalization to meet the target spectrum for the signal being used at a total sound pressure of -4.7 dBPa. This spectrum is used to calculate the send, sidetone and overall frequency responses. NOTE - In principle, a very small ideal microphone should be used to calibrate a mouth simulator, so that the physical size of the microphone does not influence the measurement. In practice, a 6.25mm laboratory measurement microphone with flat frequency response in a pressure field may be used to calibrate a HATS mouth simulator to the required accuracy. Some manufacturers recommend a free-field microphone instead, which typically has less sensitivity to mechanical vibration and results in a better calibration. The free-field microphone can be compensated to give the same frequency response as a pressure microphone by using free-field correction curves for the angle of sound incidence. The compensation is on the order of 1 dB at 8 kHz. 1373 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 33 IEEE P269/D25 October 2004 7 Test Procedure for Analog Sets 1375 7.1 General 1376 1377 1378 1379 1380 1381 1382 1383 1384 1385 1386 1387 1388 1389 1390 1391 1392 1393 1394 Procedures are given in the following clauses for measurement of receive, send, sidetone, and overall performance characteristics of handset and headset telephones. Parameters include frequency response, noise, input-output linearity, distortion, and mute.,. In addition, procedures are given for measuring telephone set impedance, howling, and maximum acoustic output. 1395 7.1.1 1396 1397 1398 1399 1400 1401 1402 1403 1404 1405 1406 1407 1408 1409 1410 1411 1412 In general, multiple test signals and stimulus levels should be used to ensure the telephone is characterized in realistic, stable, and well-defined states. This is especially the case for telephones with non-linear processes such as compression or voice activated switching (VOX) circuitry, etc. See Annex F and Annex G for further information on test signals and analysis methods. 1413 7.1.2 1414 1415 1416 1417 1418 1419 1420 The measurement shall be performed using the same format as was used for calibration. Format examples are 1/N octave bandwidth analysis, constant bandwidth analysis and R-series preferred frequencies. Measurement bandwidth shall be the same as or less than that which was used for calibration. Measurement resolution shall be the same as or coarser than that which was used for calibration. The actual bandwidth used shall be stated. 1373 1374 The telephone should be connected to the test circuit(s) described in clause 7.2. Other test circuits may be used for specific applications. Because telephone set characteristics are affected by loop impedances, terminations, loop currents, and operating levels, the measurements should be made using test loops and other conditions representative of those conditions the telephone is expected to encounter in use. Records should be kept of the measurement conditions. The measured frequency responses shall be presented as decibels relative to one pascal per volt [dB (Pa/V)] for receive, decibels relative to one volt per pascal [dB (V/Pa)] for send, decibels relative to one pascal per pascal [dB (Pa/Pa)] for sidetone and overall, and decibels relative to one volt per volt [dB (V/V)] for echo. The stimulus level and signal type shall be reported for each test. The calibration procedures described in clause 6 shall be carried out before making any measurements. The acoustical test environment shall meet the specifications given in clause 5.5. Choice of test signals and levels The standard test signal for all telephones consists of artificial voices defined in ITU-T Recommendation P.50. See (F.6.1.1) for details. Sinusoidal test signals (F.4.1) may be used for testing telephones, handsets or headsets if it can be shown that they do not have adaptive, nonlinear or dynamic signal processing (e.g. compressors, AGC, voice activity detection, adaptive echo cancellers, etc.). Such evidence must be given in the test report if sinusoidal test signals are used. Other test signals may be used when it can be shown that they produce results consistent with actual use. They also may be necessary for some specific purposes as discussed in relevant places within this standard. The measurements in this clause shall be performed at the standard test levels specified in clauses 6.7.2 and 6.6.2. Measurement bandwidth and resolution In general, the test signals and analysis methods in this standard cover a frequency range from approximately 100 to 8500 Hz. The exact range depends on the analysis method, and the test signal (see G.6 and G.7) Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 34 IEEE P269/D25 October 2004 1421 7.1.3 Choice of ear and mouth simulators and test position 1422 1423 1424 1425 Choose the ear simulator, mouth simulator and test position according to clauses 5.1, 5.2 and 5.3. This equipment shall be used for all tests described in clause 7, unless otherwise specified. The ear simulator, mouth simulator, and test position used shall be stated. 1426 7.1.4 1427 1428 1429 1430 1431 1432 1433 1434 If the telephone is equipped wi t hat on ec on t r ol ,t h et on ec on t r ols h a l lbes e tt ot h ema n uf a c t u r e r ’ sde f a u l ts e t t i ng . This is the default tone control adjustment that shall be used for all measurements. 1435 7.1.5 1436 1437 1438 All measurements shall be done at the reference receive volume control setting (3.38). A range of volume control settings may also be used where appropriate, such as minimum and maximum volume. 1439 7.1.6 1440 1441 1442 All measurements shall be done at the reference send volume control setting (3.39). A range of volume control settings may be used where appropriate, such as minimum and maximum volume. 1443 7.2 1444 1445 1446 1447 1448 1449 1450 1451 1452 1453 1454 1455 1456 1457 1458 A general-purpose DC feed circuit is shown in Figure 9Figure 9Figure 9. Since the parameters of the feed circuit affect transmission performance, they should be recorded as part of the test setup. If available, parameters should be obtained from the applicable performance specification. If not, the following values should be used: Tone control setting If no default setting is defined by the manufacturer, the tone control shall be set so that the frequency response is as close as possible to the center of the required frequency response template. The tone control shall be set before setting the volume control. If the tone and volume controls interact, an iterative process for setting these controls may be necessary. Reference receive volume control setting Reference send gain control setting Analog DC Feed circuits C 50 microfarads L 5 henries (each) R = 400 ohms, including resistance of inductors V = 50 volts A = ammeter used to measure current drawn by the telephone under test. Alternatively, the current can be fixed by a current source, regardless of the R value. In some cases, ground loops may occur when connecting test equipment to RETP or SETP. The insertion of a high quality 1:1 audio transformer can usually prevent this. If used, this transformer shall be included during calibration and when determining the loss of the feed circuit. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 35 IEEE P269/D25 October 2004 receive electrical test point (RETP) from 900 Ohm source or C C send electrical test point (SETP) to 900 Ohm load L L analog telephone R - + A V 1459 1460 1461 1462 1463 1464 1465 1466 1467 1468 1469 1470 1471 1472 1473 1474 1475 1476 1477 1478 1479 1480 Figure 9 - General purpose DC feed circuit for 2-wire analog telephone The send electrical test point (SETP) is for measuring send output signals. It shall be connected to a 900 ohm load. The receive electrical test point (RETP) is for applying receive input signals. It shall be connected to a 900 ohm source. (Other terminations may be substituted as defined by applicable performance specifications.) The loss of the feed circuit used should be measured. The loss should not be greater than 0.1 dB over the range of 100 Hz to 8,500 Hz. The loss from 20 Hz to 100 Hz should not exceed 1 dB. The circuit of Figure 9Figure 9Figure 9, using ideal components, should just meet this specification. The following procedure may be used to determine the loss of the feed circuit: a) Connect a signal generator or similar device with a 900 ohm source impedance directly to a 900 ohm resistive termination and measure the voltage across the termination. b) Insert the feed circuit between the generator and the 900 ohm resistive termination and again measure the voltage across the termination. c) The loss of the feed circuit in decibels is: Voltage across 900 ohm resistor Voltage across feed bridge 1481 Feed circuit loss 20 log 1482 1483 1484 1485 1486 This procedure should be followed for every value of direct current and frequency of interest. In practice, it is usually sufficient to measure a few conditions covering the range of values likely to be encountered and, if the effect of the feed circuit is relatively small and constant for the measured conditions, assume the characterization is sufficient. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 36 IEEE P269/D25 October 2004 1487 1488 1489 1490 1491 1492 1493 The noise level of the feeding bridge should be low enough not to influence measurement results. Feed circuit for overall measurements using two phones is shown in Figure 10Figure 10Figure 10. C C L Near-end Analog telephone C Term ination & Interconnection L RN C L L RF AN V 1494 1495 1496 1497 Far-end Analog telephone AF V Figure 10 - General purpose DC feed circuit for 2 analog telephones for overall measurements. 1498 7.3 Analog telephone network impairments 1499 1500 1501 1502 1503 1504 Telephone performance can be influenced by various conditions in the network to which a telephone is connected. The specific impairments described in clauses 7.3.1 through 7.3.6 should be investigated where applicable. Other impairments, such as ADSL signals from a high-speed modem, may be relevant for specific situations. The general method is to make a standard measurement as specified in Clauses 7.4 through 7.7, but with the impairment introduced. 1505 7.3.1 1506 1507 1508 Loop current may be varied to determine if there are any detrimental effects. This is especially important if the telephone is powered from the line rather than from a local power supply. 1509 7.3.2 1510 1511 Network noise can affect non-linear processes within an analog telephone. Network noise shall be approximated using white noise, with levels measured in dBmp. Noise shall be inserted at the RETP. 1512 7.3.3 1513 1514 1515 1516 1517 1518 1519 Network termination impedance will affect analog telephone transmission performance. A 900 ohm termination is recommended for telephones connected to a central office network. A 600 ohm termination is recommended for telephones connected to a PBX network. Loop current Network noise Termination impedance Other terminations may be used for specific applications. For example, a complex termination more typical of North American loops, may be useful for sidetone measurements. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 37 IEEE P269/D25 October 2004 1520 7.3.4 Test loops 1521 1522 1523 1524 1525 1526 1527 1528 A wireline analog telephone should be tested with various lengths of cable or simulated cable. Recommended loop lengths for testing North American telephones are 0, 2.7, and 4.6 km (0, 9, and 15 kft) of 26 AWG non-loaded cable The recommended loop simulator circuit is shown in Figure 11Figure 11Figure 11 and components for various lengths are shown in Table 3Table 3Table 3. For some measurements, particularly sidetone and howling, real cable may give results more representative of actual performance compared to the loop simulator of Figure 11Figure 11Figure 11 and Table 3Table 3Table 3. R1 L1 C2 R2 C1 R4 1529 1530 1531 1532 1533 1534 1535 1536 1537 1538 1539 1540 R3 C4 C3 L2 Figure 11 Loop simulator circuit Component 0.305 kma 0.914 kmb 1.83 kmc R1, R4 41.7 124 249 R2, R3 109 174 312 C1, C4 3.77 nF 0.0113 F 0.0226 F C2, C3 4.02 nF 0.0122 F 0.0255 F L1, L2 0.336 mH 0.983 mH 96.0 H Notes: (1) All values are 1% (2) 2.7 km and 4.6 km can be made up of cascaded sections of the aboved Table 3 Component values for 26 AWG cable a 0.305 km = 1 kft 0.914 km = 3 kft c 1.83 km = 6 kft d 2.7 km = 9 kft. 4.6 km = 15 kft b 1541 7.3.5 Parallel sets 1542 1543 1544 1545 1546 1547 1548 1549 1550 The telephone should be tested with a parallel telephone set simulator with suitable DC and AC characteristics. In general, measurements made with the parallel set simulator should be compared to the same measurements made without the simulator. The minimum recommended measurements are send and receive frequency response, loudness ratings, and distortion, each measured with standard loop lengths. The parallel telephone set simulator circuit shall have the VI curve as shown in Figure 12Figure 12Figure 12, 0.3 V over the current range of 0 to 100 mA. The return loss shall be greater than 10 dB with respect to 600 ohms from 200 to 4000 Hz. Component values may be adjusted to meet these tolerances. One possible implementation of this is shown in Figure 13Figure 13Figure 13. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 38 IEEE P269/D25 October 2004 1551 1552 Test Circuit Voltage (Volts) 15 (106.25, 10) 10 (50, 7) 5 (20, 4) 0 0 20 40 60 80 100 Test Circuit Current (mA) 1553 1554 1555 1556 1557 Figure 12 Parallel set test circuit VI curve T(+) L1 1H 600 R1 1W 47 100 1559 1560 20 F 20 F NOTES: 1. Circuit is polarity sensitive. 2 Use IN4004, or similar, for diode strings. 3. L1 may be > 1 H 4. Resistor values shall be ± 1 %. 5. R1 + L1 coil resistance should be 53 ohms. 6. The performance of this circuit is dependent on the characteristics of the diodes used and temperature. Performance of the circuit must be verified and component values may need to be adjusted to meet the requirements. R(– ) Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 39 IEEE P269/D25 October 2004 T (+) R1, 1 W 2 4 1 6 3 8 47 600 100 5 R (–) 7 T1 1561 1562 1563 1564 1565 Figure 13 Parallel telephone set simulator 1566 7.3.6 Cordless range 1567 1568 1569 A cordless telephone should be tested across the range of expected usage. This should include the minimum and maximum specified distance the telephone is expected to operate between the base unit and mobile unit. 1570 7.4 Receive 1571 7.4.1 Receive frequency response 1572 1573 1574 1575 1576 1577 1578 Receive frequency response is the ratio of sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to the voltage input at the Receive Electrical Test Point (RETP), which is expressed in decibels. The receive frequency response in dB, HR(f), is given by Equation 7.1Equation 7.1Equation 7.1. HR(f) may be used to calculate the receive loudness rating (RLR) according to ITU-T Recommendation P.79-1999. Please see Annex H. H R ( f ) 20 log 1579 1580 1581 1582 1583 1584 1585 1586 1587 1588 1589 G ERP ( f ) G RETP ( f ) in dBPa / V Equation 7.11 where: GERP(f) is the rms spectrum at ERP GRETP(f) is the rms spectrum at RETP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 1590 7.4.2 Receive noise 1591 1592 1593 1594 1595 1596 Receive noise is internally generated audio frequency noise present at the receiver when no stimulus is applied. The receiver shall be coupled to the ear simulatorwi t ht h eRETPt e r mi n a t e da n dwi t hn os i g n a li n pu t .Th et e l e ph on e ’ s microphone should be isolated from sound input and mechanical disturbances that would cause significant error. Measure the acoustic output signal, referred to the ERP, from 25100 to 8,500 Hz, averaging over a minimum period of5s e c on ds .Re c e i v en oi s es h ou l dbeme a s u r e dwi t ht h es e n dmu t ef e a t u r ebot h“ on ”a n d“ of f . ” Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 40 IEEE P269/D25 October 2004 1597 1598 1599 1600 The overall receive noise level is measured with A-weighting in dBA. The measurement may be implemented directly using an A-weighting filter, or by using single-channel FFT with Hann windowing or real-time spectrum analysis, followed by an A-weighted power summation. 1601 7.4.3 1602 1603 1604 1605 1606 1607 1608 1609 1610 1611 Receive narrow-band noise, including single frequency interference (SFI), is an impairment that can be perceived as a tone relative to the overall weighted noise level. This test measures the weighted noise level characteristics in narrow bands of not more than 31 Hz maximum from 25100 to 8,500 Hz. These levels can then be compared to the receive noise (7.4.2). 1612 7.4.4 1613 1614 1615 1616 1617 1618 1619 1620 1621 1622 1623 1624 1625 1626 1627 Receive linearity is a measure of how the frequency response changes with input level. 1628 7.4.5 1629 1630 1631 1632 1633 1634 1635 1636 1637 1638 1639 The preferred distortion measurement method is receive signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. 1640 7.4.6 1641 1642 1643 1644 1645 Re c e i v emut ei ss ome t i me sc a l l e d“ DTMFmu t e ”or“ a u t odi a lmu t e ” .Re c e i v emu t i ngi sus u a l ly automatic, but may be manually controlled, and would normally be activated by touch-t on edi a l i ng ,l i n e“ h ol d”ope r a t i on ,a c t i v a t i n gt h e hold button, or other means. Mute leakage is the amount of signal measured at the ERP when an electrical stimulus is applied to the RETP. Receive narrow-band noise The receiver shall be coupled to the ear simulator with the RETP terminated and with no signal input. Measure the A-weighted receive noise level, referred to the ERP, using a selective voltmeter or spectrum analyzer with an effective bandwidth of not more than 31 Hz, over the frequency range of 25100 to 8,500 Hz, averaging over a minimum period of 5 seconds.I fFFTa n a l y s i si su s e d,t h e na“ Fl a tTop”wi n dowi n gs h a l lbee mpl oy e d. Receive linearity The test consists of measuring the receive frequency response as specified in Clause 7.4.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus type used to measure frequency response. If artificial voices or another wideband stimulus are used, the test shall be performed at 7 levels, from –46 to –16 dBV, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –16 dBV. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies from 200 through 5000 Hz, at 7 levels, from –36 to –5 dBV, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –21 dBV. Receive distortion Receive distortion is measured at ERP using the standard input level of –16.0 dBV. Other input levels should be tested covering a range from –30 to 0 dBV. Measurements should also be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels above 0 dBV, verify that distortion of the test system is less than 1% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Receive mute leakage Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 41 IEEE P269/D25 October 2004 1646 1647 1648 1649 1650 1651 1652 1653 1654 1655 1656 1657 To measure mute leakage, engage the mute, apply the test signal, and measure the receive noise according to clause 7.4.2. The test signal shall be the same as that used for receive frequency response (7.4.1), at 0 dBV. An additional measurement shall be made using the DTMF tones of the telephone set being tested. In the case of the DTMF tones oft h et e l e ph on es e t ,t h e r ewon ’ tbea nyc ont r olov e rt h el e ve l .Ea c hr e s u l ti se x pressed in dBA, the weighted noise level which should be compared to muted receive noise measured according to 7.4.2 (with no stimulus applied). 1658 7.5 Send 1659 7.5.1 Send frequency response 1660 1661 1662 1663 1664 Send frequency response is the ratio of voltage output at the Send Electrical Test Point (SETP) to the sound pressure at the Mouth Reference Point (MRP), which is expressed in decibels. The send frequency response in dB, HS(f), is given by Equation 7.3Equation 7.3Equation 7.2 The send frequency response, HS(f) may be used to calculate the send loudness rating (SLR) according to ITU-T Recommendation P.79-1999. Please see Annex H. Note - If a sinusoidal stimulus was used to measure receive frequency response in 7.4.1, the same sinusoidal frequency pattern shall be used for the mute measurement, but only over the range of 200-4000 Hz, at 0 dBV. The absolute level at each frequency is measured, not the frequency response. A-weighting should be applied to the result, expressed in dBA as a function of frequency. The weighting permits more relevant comparison with results obtained with artificial voices. H S ( f ) 20 log 1665 1666 1667 1668 1669 1670 1671 1672 1673 1674 G SETP ( f ) G MRP ( f ) in dBV / Pa Equation 7.3322 where: GSETP(f) is the rms spectrum at SETP GMRP(f) is the rms spectrum at MRP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 1675 7.5.2 Send noise 1676 1677 1678 1679 1680 1681 1682 1683 1684 1685 1686 1687 1688 1689 Send noise is internally generated audio frequency noise present at the SETP. Measure the electrical output signal at SETP, averaging over a mi n i mum pe r i odof5s e c on ds .Th et e l e ph on e ’ smi c r oph on es h ou l dbei s ol a t e df r om s ou n d input and mechanical disturbances that would cause significant error. Send noise should be measured with the mute f e a t u r ebot h“ on ”a n d“ of f . ” 1690 7.5.3 1691 1692 Send narrow-band noise, including single frequency interference (SFI), is an impairment that can be perceived as a tone relative to the overall weighted noise level. This test measures the weighted noise level characteristics in Send overall noise shall be measured and reported in units of dBmp. It shall also be measured with A-weighting (defined in ANSI S1.4), reported in units of dBm(A). Measurements in dBmp and dBm(A) are generally not the same, and they may not be correlated. Psophometric measurements are made from 25100-6000 Hz, while A-weighted measurements are made from 25100-8,500 Hz. These measurements can be made directly using a psophometrically weighted or A-weighted noise meter with the correct terminating impedance. The measurement may also be implemented using a single-channel FFT with Hann windowing, or a real-time spectrum analysis, followed by a weighted power summation. Send narrow-band noise Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 42 IEEE P269/D25 October 2004 1693 1694 1695 1696 1697 1698 1699 1700 1701 1702 1703 1704 narrow bands of not more than 31 Hz maximum from 25100 –60500 Hz. These levels can then be compared to the send noise (7.5.2). 1705 7.5.4 1706 1707 1708 1709 1710 1711 1712 1713 1714 1715 1716 1717 1718 1719 1720 1721 1722 Send linearity is a measure of how the frequency response changes with input level. 1723 7.5.5 1724 1725 1726 1727 1728 1729 1730 1731 1732 1733 1734 The preferred distortion measurement method is send signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. 1735 7.5.6 1736 1737 1738 1739 1740 1741 1742 1743 The mute function is for voice privacy during line hold and mute. Send muting is often manually controlled, but may be automatically controlled. Mute leakage is the amount of signal measured at the SETP when an acoustic stimulus is applied to the handset or headset microphone. The handset or headset should be isolated from sound input and mechanical disturbances that would cause significant error. Measure the psophometrically-weighted noise level at the SETP with a selective voltmeter or spectrum analyzer with an effective bandwidth of not more than 31 Hz, over the frequency range of 25100 to 60500 Hz, averaging over a minimum period of 5 seconds.I fFFTa n a l y s i si sus e d,t h e na“ Fl a tTop”wi n dowi ngs h a l lbe employed. The procedure shall be repeated using A-weighting instead of psophometric weighting, and the frequency range shall be changed to 25100 –8500 Hz. Send linearity The test consists of measuring the send frequency response as specified in Clause 7.5.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus type used to measure frequency response. If artificial voices or another wideband test signal are used, the test shall be performed at 7 levels from –34.7 dBPA to –4.7dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies from 200 through 5000 Hz, at 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. Send distortion Send distortion is measured at SETP using the standard input level of –4.7 dBPa. Other input levels should be tested covering a range from –30 to +10 dBPa. Measurements should also be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 2% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Send mute leakage To measure mute leakage, engage the mute, apply the test signal, and measure the send noise according to clause 7.5.2. The test signal shall be the same as that used for send frequency response (7.5.1), at +5 dBPa. The result is expressed in dBmp, a weighted noise level which should be compared to muted broad-band noise measured according to 7.5.2 (with no stimulus). Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 43 IEEE P269/D25 October 2004 1744 1745 1746 1747 1748 1749 1750 Note - If a sinusoidal stimulus was used to measure send frequency response in 7.5.1, the same sinusoidal frequency pattern shall be used for the mute measurement, but only over the range of 200-4000 Hz, at +5 dBPa. The absolute level at each frequency is measured, not the frequency response. Psophometric weighting should be applied to the result, expressed in dBmp as a function of frequency. The weighting permits more relevant comparison with results obtained with artificial voices. 1751 7.5.7 1752 1753 1754 1755 1756 1757 1758 1759 1760 1761 1762 1763 1764 Send frequency response in a diffuse field is a measure of how much of the noise in the room where a telephone is being used is transmitted to the network. It is the ratio of voltage output at the Send Electrical Test Point (SETP) to the sound pressure at the Diffuse Field Test Point (DFTP, see 5.5.3), which is expressed in decibels. The diffuse field send frequency response in dB, HSD(f), is given by equation Equation 7.5Equation 7.5Equation 7.3. Send frequency response in a diffuse field The diffuse field send frequency response may be sensitive to both the level and type of signal used. This measurement may be performed in 1/3 octave resolution. During the measurement, the mouth simulator is present but not active, with the MRP is located at the DFTP. The mouth simulator is not present during calibration. H SD ( f ) 20 log 1765 1766 1767 1768 1769 1770 1771 1772 1773 1774 G SETP ( f ) G DFTP ( f ) in dBV / Pa Equation 7.5533 where: GSETP(f) is the rms spectrum at SETP GDFTP(f) is the rms spectrum at DFTP The cross-spectrum method is not recommended. 1775 7.5.8 Send signal-to-noise ratio 1776 1777 1778 Send signal-to-noise ratio is a measure of the desired speech transmission relative to unwanted noise in the room whe r et h et a l k e r ’ sph on ei sus e d.Se eAnnex K. 1779 7.6 1780 1781 Sidetone should be measured at minimum, reference, and maximum volume settings. 1782 7.6.1 1783 1784 1785 1786 1787 1788 1789 1790 Talker sidetone frequency response is the ratio of the sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to the sound pressure at the Mouth Reference Point (MRP), which is expressed in decibels. The talker sidetone frequency response in dB, HTS(f), is given by Equation 7.7Equation 7.7Equation 7.4. Talker sidetone frequency response may be used to calculate the sidetone masking rating (STMR) according to ITUT Recommendation P.79-1999. Please see Annex H. Sidetone Talker sidetone frequency response The STMR measured on an open-ear HATS is approximately 24 dB. This represents the effective floor of STMR measurements on actual telephones. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 44 IEEE P269/D25 October 2004 1791 1792 H TS ( f ) 20 log 1793 1794 1795 1796 1797 1798 1799 1800 1801 1802 G ERP ( f ) G MRP ( f ) in dBPa / Pa Equation 7.7744 where: GERP(f) is the rms spectrum at ERP GMRP(f) is the rms spectrum at MRP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 1803 7.6.2 1804 1805 1806 1807 1808 1809 1810 1811 Listener sidetone is a measure of the signal present at the receiver due to sound in the room where the telephone is used. The measurement is similar to talker sidetone, except that the stimulus signal is generated in the entire test room, and not presented from a mouth simulator. Listener sidetone frequency response is the ratio of the sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to the sound pressure from a diffused sound field at the DFTP (5.5.3), which is expressed in decibels. The listener sidetone frequency response in dB, HLS(f), is given by Equation 7.9Equation 7.9Equation 7.5. H LS ( f ) 20 log 1812 1813 1814 1815 1816 1817 1818 1819 1820 1821 1822 1823 1824 1825 1826 1827 1828 1829 Listener sidetone frequency response G ERP ( f ) G DFTP ( f ) in dBPa / Pa Equation 7.9955 where: GERP(f) is the rms spectrum at ERP GDFTP(f) is the rms spectrum of the diffuse sound field in the room The cross-spectrum method is not recommended for listener sidetone frequency response calculation. This measurement is conducted using a uniform diffuse sound field as specified in clause 5.5.3. This measurement may be performed in 1/3 octave resolution. The level of the test signal should be in the range of 40–65 dBA. The level and spectrum used should be reported. For measurement of listener sidetone, the handset or headset is mounted on an appropriate test fixture. The mouth simulator is present, but not active, with the MRP at the DFTP. 1830 7.6.3 Alternate method for listener sidetone 1831 1832 1833 1834 1835 1836 1837 1838 For the alternate method, listener sidetone response HLS(f) can be approximated by Equation 7.11Equation 7.11Equation 7.6. It is the talker sidetone response HTS(f) minus the difference in send frequency responses from the standard near field method and a similar method using a diffuse noise signal. To use this alternate method, measure the talker sidetone per 7.6.1, measure the send frequency response per 7.5.1, then measure the send frequency response in a diffuse field per 7.5.7 and apply Equation 7.11Equation 7.11Equation 7.6. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 45 IEEE P269/D25 October 2004 H LS ( f ) H TS ( f ) [ H S ( f ) H SD ( f ) ] in dBPa / Pa 1839 1840 1841 1842 1843 1844 1845 1846 1847 1848 1849 Equation 7.111166 where HTS(f) = Talker sidetone response HS(f) = Send frequency response, standard method HSD(f) = Send frequency response in a diffuse field CAUTION: This method may not be valid when the send, receive or sidetone path has nonlinear characteristics. 1850 7.6.4 Sidetone linearity 1851 1852 1853 1854 1855 1856 1857 1858 1859 1860 1861 1862 1863 1864 1865 Sidetone linearity is a measure of how the frequency response changes with input level. 1866 7.6.5 1867 1868 1869 1870 1871 1872 1873 1874 1875 1876 1877 The preferred distortion measurement method is sidetone signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. 1878 7.6.6 1879 1880 1881 Sidetone delay is measured between the mouth simulator and the ear simulator, using one of the methods described in Annex L 1882 7.6.7 1883 1884 If round trip sidetone delay is more than 5 ms, sidetone echo response should be measured. See Annex M. The test consists of measuring the talker sidetone frequency response as specified in Clause 7.6.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus type used to measure frequency response. If artificial voices or another wideband test signal are used, the test shall be performed at 7 levels from –34.7 dBPA to –4.7 dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies from 200 through 5000 Hz, at 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. Sidetone distortion Sidetone distortion is measured at ERP using the standard input level of –4.7 dBPa. Other input levels should be tested covering a range from –30 to +10 dBPa. Measurements should also be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 2% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Sidetone delay Sidetone echo response Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 46 IEEE P269/D25 October 2004 1885 7.7 Overall 1886 7.7.1 Overall frequency response 1887 1888 1889 1890 1891 1892 1893 1894 1895 1896 1897 Overall frequency response is measured on two telephones connected as shown in Figure 10Figure 10Figure 10. This is a simulated end-to-end setup requiring two test fixtures acoustically isolated from each other. The test conditions should generally be the same as those used for send and receive measurements on the same telephone(s). Overall frequency response is the ratio of the sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), on the far-end telephone, to the sound pressure at the Mouth Reference Point (MRP) for the near-end telephone, which is expressed in decibels. The overall frequency response in dB, HO(f), is given by Equation 7.13Equation 7.13Equation 7.7. It may be used to calculate the overall loudness rating (OLR) according to ITU-T Recommendation P.79-1999. Please see Annex H. H O ( f ) 20 log 1898 1899 1900 1901 1902 1903 1904 1905 1906 1907 G ERP ( f ) G MRP ( f ) in dBPa / Pa Equation 7.131377 where: GERP(f) is the rms spectrum at ERP GMRP(f) is the rms spectrum at MRP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 1908 7.7.2 Overall linearity 1909 1910 1911 1912 1913 1914 1915 1916 1917 1918 1919 1920 1921 1922 1923 Overall linearity is a measure of how the frequency response changes with input level. 1924 7.7.3 1925 1926 1927 Overall distortion is measured in a similar manner to sidetone distortion. However, this measurement is between two telephone sets connected across a network connection. 1928 7.8 1929 1930 These measurements should be made at the standard test level of –16 dBV. The test consists of measuring the overall frequency response as specified in Clause 7.7.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus type used to measure frequency response. If artificial voices or another wideband test signal are used, the test shall be performed at 7 levels from –34.7 dBPA to –4.7 dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies from 200 through 5000 Hz, at 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. Overall distortion Telephone set impedance Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 47 IEEE P269/D25 October 2004 1931 7.8.1 AC impedance 1932 1933 1934 The impedance, measured at the line terminals of the telephone set, should be determined over the frequency range 100 Hz to 8500 Hz. 1935 7.8.2 1936 1937 1938 1939 Return loss is defined by Equation 7.15Equation 7.15Equation 7.8, and measured with the circuit in Figure 14Figure 14Figure 14: Return loss RL ( f ) 20 log 1940 1941 1942 1943 1944 1945 1946 1947 VA VB Equation 7.151588 Where RL(f) = return loss VA = voltage applied to test circuit VB = voltage measured at test point ZR G R1 VA VB R1 1948 1949 1950 1951 1952 1953 1954 1955 1956 1957 1958 DC Feed Circuit CR RR Telephone Figure 14 Return loss test circuit ZR = reference impedance consisting of RR and CR (typical) R1 = 600 ohms (typical). Resistors R1 shall match within 0.5% or better G = signal generator Echo return loss can be calculated from return loss according to ITU-T G.122 (1993) Annex B, Section B.4 (trapezoidal rule). 1959 7.9 Howling 1960 1961 1962 1963 1964 1965 1966 1967 Telephones can experience instability such as howling, acoustic feedback, or oscillation , when subjected to various loop circuits, receive volume control settings, and physical positioning of the handset or headset. Instability can be evaluated using the feed circuit described in Clause 7. The instability should be checked over a range of loop lengths. The position of the handset or headset can have a major effect on the acoustic stability of the telephone, as nearby acoustic reflecting surfaces can add to the feedback of the receiver into the microphone. For each test setup, the telephone shall be evaluated with the receive volume control in the reference receive volume control and reference send gain control setting, the lowest volume setting, and the highest volume setting. Instability Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 48 IEEE P269/D25 October 2004 1968 1969 1970 1971 1972 1973 can be perceived as an audible howling or whistling from the telephone receiver, or repetitive fluctuation of the telephone set line current. 1974 7.10 1975 1976 1977 1978 1979 1980 1981 1982 1983 1984 1985 1986 1987 1988 In each test loop or receive volume control setting, the handset or headset should be placed in a minimum of four physical positions: Face up, face down and lying sideways on a hard flat surface, and in the reference corner shown in Figure 7Figure 7Figure 7 of clause 5.6.1. Maximum acoustic output The testing methods provided in this clause only cover the application of in-band signals, but the same sound pressure limits may apply if ringing signals appear in the handset or headset receiver while the telephone set is offhook. See Annex N for a discussion of maximum pressure limits. Maximum acoustic output measurements shall be made on the same ear simulator and with the same positioning and force as used for receive frequency response measurements. For handsets measured on HATS, an additional measurement with a force of 13N is required. See 5.3.2 for handsets, and 5.3.3 for headsets. Telephone sets with adjustable receive volume controls shall be adjusted to the maximum setting. Acoustic output can be referenced to the ERP, DRP, free field (0 degrees elevation and azimuth) or to a diffuse field, as required by the appropriate safety standard. This may require measurements made at one reference point be translated to the required reference point. A filter may be required. See Annex C. 1989 7.10.1 Maximum acoustic pressure (long duration) 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 The maximum acoustic pressure is the maximum steady state sound pressure emitted from a receiver. The stimulus for this test is a slow logarithmic sine sweep applied at RETP from 100 to 8500 Hz. The measurement shall be made with real-time filter analysis (RTA) in 1/12 octave bands, described in G.3. The detector shall be set to rms fast, which is a 250ms effective averaging time (equivalent to a 125ms time constant). The detector shall be set to hold the maximum level achieved in each band during the entire sweep. 2003 7.10.2 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 The peak acoustic pressure is the maximum unweighted peak sound pressure emitted from a telephone receiver. The stimulus for this test is a surge applied at RETP. The measurement shall be made at the ear simulator with an u nwe i gh t e d“ pe a kh ol d”l e v e lde t e c t orwi t har i s et i mee qu a lt o,orl e s st h a n ,50µs . The sweep time shall be at least 90 seconds. A sweep time should be selected that provides consistent results with no underestimation. That is, the result should be within 0.5 dB at all frequencies for a test period ± 30 seconds. Additional consideration should be given to the acoustic pressure caused by tones, other audio signals, or long duration, high amplitude electrical signals applied to power, network, or auxiliary leads of the telephone. Peak acoustic pressure (short duration) The 10/700 s surge generator specified in clause 6.2 of IEC 61000-4-5 shall be used. The open circuit voltage shall be 1000 volts, and the short circuit current shall be 25 amps. Measure the peak pressure in the ear simulator while operating the surge generator. An oscilloscope or a sound level me t e r ,h a v i nga nu nwe i gh t e d“ pe a kh ol d”s e t t i ngi sus e dt oma k et h eme a s u r e me n t .Re v e r s et h et e l e ph on es e t connections and repeat. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 49 IEEE P269/D25 October 2004 2015 8 Test Procedures for Digital and 4-wire Systems 2016 8.1 General 2017 2018 2019 2020 2021 2022 2023 2024 2025 2026 2027 2028 2029 2030 2031 2032 2033 2034 2035 2036 The test procedures for digital telephone sets generally follow those for analog telephone sets when using a reference codec as the digital interface. The procedures in this clause assume a telephone set equipped with a handset or headset. 2037 8.1.1 2038 2039 2040 2041 2042 2043 2044 2045 2046 2047 2048 2049 2050 2051 2052 2053 2054 In general, multiple test signals and stimulus levels should be used to ensure the telephone is characterized in realistic, stable and well-defined states. This is especially the case for telephones with non-linear processes such as compression or voice activated switching (VOX) circuitry, etc. See Annex F & Annex G for further information on test signals and analysis methods. 2055 8.1.2 2056 2057 2058 2059 2060 2061 2062 2063 The measurement shall be performed using the same format as was used for calibration. Format examples are 1/N octave bandwidth analysis, constant bandwidth analysis and R-series preferred frequencies. Measurement bandwidth shall be the same as or less than that which was used for calibration. Measurement resolution shall be the same as or coarser than that which was used for calibration. The actual bandwidth used shall be stated. Procedures are given in the following clauses for measurement of parameters affecting the receive, send, sidetone, and overall performance characteristics of digital telephone sets. These parameters include frequency response, noise, linearity, distortion, delay, and out-of-band signals. In addition, procedures are given for measuring echo, stability loss, convergence time, discontinuous speech transmission and maximum acoustic output. The telephone should be connected to the test circuit(s) described in clause 8.2. Other test circuits may be used for specific applications. Records should be kept of the measurement setup and conditions. The measured frequency responses shall be presented as decibels relative to one pascal per volt [dB (Pa/V)] for receive, decibels relative to one volt per pascal [dB (V/Pa)] for send, decibels relative to one pascal per pascal [dB (Pa/Pa)] for sidetone and overall, and decibels relative to one volt per volt [dB (V/V)] for echo. The stimulus level and signal type shall be reported for each test. The calibration procedures described in clause 6 shall be carried out before making any measurements. The acoustical test environment shall meet the specifications given in clause 5.5. Choice of test signals and levels The standard test signal for all telephones consists of artificial voices defined in ITU-T Recommendation P.50. See (F.6.1.1) for detail Sinusoidal test signals (F.4.1) may be used for testing telephones, handsets or headsets if it can be shown that they do not have adaptive, nonlinear or dynamic signal processing (e.g. compressors, AGC, voice activity detection, adaptive echo cancellers, etc.). Such evidence must be given in the test report if sinusoidal test signals are used. Other test signals may be used when it can be shown that they produce results consistent with actual use. They also may be necessary for some specific purposes as discussed in relevant places within this standard. The measurements in this clause shall be performed at the standard test levels specified in 6.7.2 and 6.6.2. Measurement bandwidth and resolution In general, the test signals and analysis methods in this standard cover a frequency range from approximately 100 to 8500 Hz. The exact range depends on the codec, analysis method, and the test signal (see G.6 and G.7). Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 50 IEEE P269/D25 October 2004 2064 8.1.3 Choice of ear and mouth simulators and test position 2065 2066 2067 2068 2069 2070 Choose the ear simulator, mouth simulator and test position according to clauses 5.1, 5.2, & 5.3. This equipment shall be used for all tests described in clause 8, unless otherwise specified. The ear simulator, mouth simulator, and test position used shall be stated. 2071 8.1.4 2072 2073 2074 2075 2076 2077 2078 2079 If the telephone is equipped with a tone control, the tone control shall be set to the manuf a c t u r e r ’ sde f a u l ts e t t i ng . This is the default tone control adjustment that shall be used for all measurements. 2080 8.1.5 2081 2082 2083 All measurements shall be done at the reference receive volume control setting (3.38) A range of volume control settings may also be used where appropriate, such as minimum and maximum volume. 2084 8.1.6 2085 2086 2087 All measurements shall be done at the reference send volume control setting (3.39). A range of volume control settings may be used where appropriate, such as minimum and maximum volume. 2088 8.2 Digital test circuits 2089 8.2.1 Digital telephone interface 2090 2091 2092 2093 2094 2095 2096 2097 2098 2099 2100 2101 2102 2103 2104 2105 2106 2107 2108 If analog test equipment is used, the digital telephone under test shall be connected to the reference codec through an interface as shown in Figure 15Figure 15Figure 15. The interface shall provide all the signaling and supervisory sequences necessary for the telephone set to work in all test modes. The interface shall also be capable of converting a digital stream to or from the telephone set under test to a format compatible with the reference codec. For wideband applications, the Type 1 ear simulator shall not be used, since it is intended for use only to 4,000 Hz. Tone control setting If no default setting is defined by the manufacturer, the tone control shall be set so that the frequency response is as close as possible to the center of the required frequency response template. The tone control shall be set before setting the volume control. If the tone and volume controls interact, an iterative process for setting these controls may be necessary. Reference receive volume control Reference send gain control setting The send electrical test point (SETP) is for measuring send output signals. It shall be connected to a 600 ohm load. The receive electrical test point (RETP) is for applying receive input signals. It shall be connected to a 600 ohm source. If digital test equipment is used, the digital telephone under test shall be connected using a direct digital interface as shown in Figure 16Figure 16Figure 16. In this case, a reference codec is not required, as the measurements are done in the digital domain. SETP and RETP would then be located at the digital translation interface. Digital signals must be referenced to the analog equivalent as defined in 8.2.2. For wireless telephones, the interface is the same, except that a radio link is also included in the interface. The interfacing for overall response consists of two telephone sets connected back-to-back through the appropriate digital telephone interface, with or without the ideal codec as necessary. (Figure 17Figure 17Figure 17) Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 51 IEEE P269/D25 October 2004 2109 Reference Codec Linear PCM to Analog (600 Ohms) RETP (600 Ohm Source) SETP (600 Ohm Load) 2110 2111 2112 2113 2114 2115 2116 Figure 15 –Analog interface to a digital set Linear PCM Digital Format 2117 2118 2119 2120 2121 2122 2123 2124 2125 Digital Translation Interface (as needed) RETP SETP Digital Translation Interface (as needed) Figure 16 –Digital interface to a digital set Digital Translation Interface (as needed) 2126 2127 2128 2129 2130 2131 2132 Digital Translation Interface (as needed) Figure 17 –digital interfacing for overall measurements Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 52 IEEE P269/D25 October 2004 2133 8.2.2 Reference codec 2134 8.2.2.1 General 2135 2136 2137 2138 A reference codec is used for testing a digital telephone with analog test equipment. The standard for encoding voice frequency signals in North America is the µ-law, which is defined in ITU-T Recommendation G.711. The codec defined in this clause is based on that standard. For other coding schemes, an appropriate codec should be used. 2139 8.2.2.2 2140 2141 2142 2143 2144 2145 2146 2147 2148 2149 2150 2151 2152 2153 2154 The analog input and output impedance of the reference codec shall be 600 ohms. In the previous version of this standard, a termination impedance of 900 ohms was used to be consistent with analog telephone set measurements. In this version, a 600 ohm termination is used for international harmonization. 2155 8.2.2.3 2156 2157 2158 2159 2160 2161 2162 2163 In addition, reference codec characteristics, such as attenuation versus frequency distortion, idle channel noise, and quantizing distortion should meet or exceed characteristics specified in ITU-T Recommendation G.714 [6]. 2164 8.2.3 Wideband reference codec 2165 8.2.3.1 General 2166 2167 2168 2169 There are a number of wideband codecs being used including ITU-T G.722, and low bit rate vocoders, such as G.722.1, G.723.1, and G.729. However, the codec defined in this clause is based on 16 bit, 16 kHz linear PCM coding or 256 kbit/s. For other coding schemes, an appropriate codec should be used. 2170 8.2.3.2 2171 2172 2173 2174 2175 2176 2177 2178 The analog input and output impedance of the reference codec shall be 600 ohms. In the previous version of this standard, a termination impedance of 900 ohms was used to be consistent with analog telephone set measurements. In this version, a 600 ohm termination is used for international harmonization. Conversion Relationships For the digital-to-analog (D/A) converter, a digital test sequence (DTS) representing the pulse-code modulation (PCM) equivalent of an analog sinusoidal signal whose rms value is 3.17 dB below the maximum full load capacity of the codec shall generate 0 dBm in a 600 ohm load. For the analog-to-digital (A/D) converter, a 0 dBm signal from a 600 ohm source shall give the DTS representing the PCM equivalent of an analog sinusoidal signal whose rms value is 3.17 dB below the maximum full-load capacity of the codec. Note that a 0 dBm signal is not the maximum digital code. For µ-law codecs 0 dBm is 3.17 dB below digital full scale. For A-law codecs 0 dBm is 3.14 dB below digital full scale. Other Parameters The idle channel noise should be less than -84 dBmp when receiving one of the quiet codes or when the A/D digital output is connected to the D/A digital input. The quantizing distortion of the reference codec should approach theoretical limits specified in Annex A of ITU-T Recommendation O.133. The intrinsic error of µ-law PCM encoding limits the signal-to-distortion ratio to about 38 dB. Conversion Relationships For the digital-to-analog (D/A) converter, a digital test sequence (DTS) representing the pulse-code modulation (PCM) equivalent of an analog sinusoidal signal whose rms value is 3.17 dB below the maximum full load capacity of the codec shall generate 0 dBm in a 600 ohm load. This is the same as prescribed for G.711. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 53 IEEE P269/D25 October 2004 2179 2180 2181 2182 For the analog-to-digital (A/D) converter, a 0 dBm signal from a 600 ohm source shall give the DTS representing the PCM equivalent of an analog sinusoidal signal whose rms value is 3.17 dB below the maximum full-load capacity of the codec. Here again, the conversion is the same as G.711. 2183 8.2.3.3 2184 2185 2186 2187 2188 2189 2190 In addition, wideband reference codec characteristics, such as frequency bandwidth and idle channel noise should meet or exceed the characteristics specified below. 2191 8.3 2192 2193 2194 2195 2196 2197 2198 2199 2200 2201 2202 2203 The most common digital impairments include delay, bit errors, frame or packet loss, and network echo cancellers which the phone might encounter. There are many commercial units available to induce these impairments, and are usually specific to the type of digital transmission system being tested. 2204 8.3.1 2205 2206 2207 2208 2209 2210 2211 2212 2213 2214 Network delay, or latency, is the most important impairment for packet voice network devices. If the device features non-linear processes (echo cancellation, or voice activity detection) to enhance voice quality, these processes can be sensitive to network delay. In this case, echo canceller performance (see clauses 8.11 and 8.12) should be checked with simulated network delay of 50, 150 and 300ms one way to ensure that performance is not degraded. 2215 8.3.2 2216 2217 2218 2219 2220 2221 2222 2223 2224 2225 Jitter is a variation in network or device delay due to the late or early arrival of packets in packet based systems. Jitter can cause problems with some of the test methods. If possible, jitter should be removed during testing. This can be done by increasing the size of the jitter buffer, resulting in a longer, but stable delay. This stable delay can then be measured, and the result used to offset the source and measurement signal where temporal correlation of these are important to the test. Other Parameters The nominal 3 dB bandwidth shall be 50 Hz to 7,000 Hz with anti-aliasing filter ripple less than ± 0.5 dB. The idle channel noise should be less than -89 dBm unweighted across this same bandwidth when receiving the quiet code or when the A/D digital output is connected to the D/A digital input. Digital telephone network impairments Network impairments can vary between types of voice networks. With the introduction of packet voice transmission, such as Voice over IP (VoIP), new types of impairments have been introduced. Impairments in ISDN and similar systems are typically limited to speech compression transcoding (A-law to u-law conversions etc.), speech path compression (G.726 ADPCM compression) and delay. Some tests are sensitive to these impairments, and it is important to understand the performance of the telephone and the suitability of the test method in the presence of these impairments. For each impairment, the affected tests are described. Network Delay Delay in the device or test setup may affect some tests and the methodology used. It is important to understand how much delay can be tolerated by each particular test performed. Delay should be measured, and the result used to offset the source and measurement signals where temporal correlation of these are important to the test. The crossspectrum method for frequency response is one example where system delay must be taken into account. Jitter If the jitter can not be sufficiently controlled, then all tests must be performed with caution. In this case, the crossspectrum method for frequency response shall not be used. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 54 IEEE P269/D25 October 2004 2226 8.3.3 2227 2228 2229 2230 2231 2232 2233 2234 2235 2236 Packet networks can suffer from congestion, causing jitter, buffer under-runs/over-runs, or packets arriving out of order. This typically results in lost packets. Some devices may feature packet loss protection algorithms. It is beyond the scope of this standard to detail a test method for packet loss protection performance. It is recommended that a perceptually based test of packet loss protection be used. A suitable example is PESQ (ITU-T Recommendation P.832) with 1%, 5% and 10% packet loss, normally distributed with respect to time. Many networks may experience bursty packet loss; however, it is outside the scope of this standard to define a bursty distribution. 2237 8.3.4 2238 2239 2240 2241 2242 2243 2244 2245 2246 2247 2248 Network echo cancellers are typically deployed when network delay exceeds 25ms, one way, and may also be present in the test interface. Echo cancellers can affect non-linear speech path quality enhancing processes due to filters and echo suppression algorithms. 2249 8.3.5 2250 2251 2252 2253 2254 2255 2256 2257 2258 Discontinuous speech transmission (DTX) is implemented by a voice/speech activity detector (VAD/SAD) in both the phone and network. It detects when the speech path is idle in a particular transmission direction. The system will then disable the speech path, allowing additional bandwidth for other network traffic. DTX may cause noise pumping, and both front end speech clipping and trailing speech clipping. 2259 8.4 Receive 2260 8.4.1 Receive frequency response 2261 2262 2263 2264 2265 2266 Receive frequency response is the ratio of sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to the voltage input at the Receive Electrical Test Point (RETP), which is expressed in decibels. The receive frequency response in dB, HR(f), is given by Equation 8.1Equation 8.1Equation 8.1. The receive response, HR(f), may be used to calculate the receive loudness rating (RLR), according to ITU-T Recommendation P.79-1999. Please see Annex H. All other measurements in Clause 8 shall be performed with packet loss set to zero. Network Echo Canceller When a network echo canceller is inserted into the system under test, it is recommended that the send, receive and overall frequency responses and respective loudness rating, as well as linearity, distortion and noise be tested with network echo cancellers both enabled and disabled. All other measurements should operate transparently in the presence of a network echo canceller and should not need to be investigated. Discontinuous Speech Transmission If the phone and test system support DTX, frequency responses, loudness ratings, linearity, and distortion should be measured with the feature both enabled and disabled. Speech like test signals shall be used for frequency response and loudness rating measurements since the DTX algorithm may interpret steady state test signals as noise. H R ( f ) 20 log 2267 2268 2269 2270 2271 2272 Network Packet Loss G ERP ( f ) G RETP ( f ) in dBPa / V Equation 8.19 where: GERP(f) is the rms spectrum at ERP GRETP(f) is the rms spectrum at RETP Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 55 IEEE P269/D25 October 2004 2273 2274 2275 2276 In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 2277 8.4.2 2278 2279 2280 2281 2282 2283 2284 2285 2286 2287 2288 2289 Receive noise is internally generated audio frequency noise present at the receiver when no stimulus is applied. Connect the telephone set to the reference codec, and transmit idle code or silence to RETP. The receiver shall be c ou pl e dt ot h ee a rs i mul a t or . Th et e l e ph on e ’ smi c r oph ones h oul dbei s ol a t e df r om s ou n di n pu ta n dme c h a n i c a l disturbances that would cause significant error. Measure the acoustic output signal, referred to the ERP, from 25100 to 8,500 Hz, averaging over a minimum period of 5 seconds. Receive noise should be measured with the telephone mut ef e a t u r ebot h“ on ”a n d“ of f . ” 2290 8.4.3 2291 2292 2293 2294 2295 2296 2297 2298 2299 2300 2301 2302 Narrow-band noise, including single frequency interference (SFI), is an impairment that can be perceived as a tone depending on its level relative to the overall weighted noise level. This test measures the weighted noise level characteristics in narrow bands of not more than 31 Hz, from 25100 to 8,500 Hz. These levels can then be compared to the receive noise level (8.4.2). 2303 8.4.4 2304 2305 2306 2307 2308 2309 2310 2311 2312 2313 2314 2315 2316 2317 2318 Receive linearity is a measure of how the frequency response changes with input level. 2319 8.4.5 2320 2321 The preferred distortion measurement method is receive signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. For the narrow band Receive noise The receive noise level is measured with A-weighting in dBA. The measurement may be implemented directly using an A-weighting filter, or by using single-channel FFT with Hann windowing or real-time spectrum analysis, followed by an A-weighted power summation. Receive narrow-band noise The receiver shall be coupled to the ear simulator with idle code or silence at RETP. Measure the A-weighted receive noise level, referred to the ERP, using a selective voltmeter or spectrum analyzer with an effective bandwidth of not more than 31 Hz, over the frequency range of 25100 to 8500 Hz, averaging over a minimum period of 5 seconds.I fFFTa n a l y s i si sus e d,t h e n“ Fl a tTop ”wi n dowi ngs h a l lbee mpl oyed. The same procedure applies for wide-band telephony applications. Receive linearity The test consists of measuring the receive frequency response as specified in Clause 8.4.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus used to measure frequency response, except that the analysis bandwidth is different. For the narrow band codec, the analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the analysis bandwidth is typically 100 to 6800 Hz. If artificial voices or another wideband stimulus are used, the test shall be performed at 7 levels, from–48.2 to 18.2 dBV, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –18.2 dBV. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies, at 7 levels, from –38.2 to –8.2 dBV, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –23.2 dBV. Receive distortion Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 56 IEEE P269/D25 October 2004 2322 2323 2324 2325 2326 2327 2328 2329 2330 2331 2332 codec, the stimulus bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus bandwidth is typically 100 to 6800 Hz. In all cases the analysis bandwidth is 100 Hz to 8500 Hz. 2333 8.4.6 2334 2335 2336 2337 2338 2339 2340 2341 2342 2343 2344 2345 2346 2347 2348 2349 2350 Re c e i v emut ei ss ome t i me sc a l l e d“ DTMFmu t e ”or“ a u t odi a lmu t e ” .Re c e i v emu t i ngi sus u a l l ya u t oma t i c ,bu tma y be manually controlled, and would normally be activated by touch-t on edi a l i ng ,l i n e“ h ol d”ope r a t i on ,a c t i v a t i n gt h e hold button, or other means. Mute leakage is the amount of signal measured at the ERP when an electrical stimulus is applied to the RETP. 2351 8.4.7 2352 2353 2354 2355 2356 2357 2358 2359 Delay is an important factor for digital telephones and network edge devices. It is a measure of the time taken for an excitation signal to traverse a given speech path for the device. Some devices may have delay in excess of 50 ms, as well as a variable delay or jitter. 2360 8.4.8 2361 2362 2363 2364 2365 2366 2367 2368 2369 2370 2371 2372 Receive out-of-band signals are signals that appear outside the specified frequency range for any input that is inside the specified frequency range. This test is designed to ensure that speech processing, coding, or compression is properly implemented. Receive distortion is measured at ERP using the standard input level of –18.2 dBV. Other input levels should be tested covering a range from –30 to 0 dBV. Measurements also should be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 1% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Receive mute leakage To measure mute leakage, engage the mute, apply the test signal, and measure the receive noise according to clause 8.4.2. The test signal shall be the same as that used for receive frequency response (8.4.1), at 0 dBV. An additional measurement shall be made using the DTMF tones of the telephone set being tested. In the case of the DTMF tones oft h et e l e ph on es e t ,t h e r ewon ’ tbea nyc on t r olov e rt h el e v e l .Ea c hr e s u l ti se x pr e s s e di ndBA,awe i gh t e dn oi s e level which should be compared to muted receive noise measured according to 8.4.2 (with no stimulus applied). Note - If a sinusoidal stimulus was used to measure receive frequency response in 8.4.1, the same sinusoidal frequency pattern shall be used for the mute measurement, but only over the range of 200-4000 Hz, at 0 dBV. The absolute level at each frequency is measured, not the frequency response. A-weighting should be applied to the result, expressed in dBA as a function of frequency. The weighting permits more relevant comparison with results obtained with artificial voices. Receive delay Receive delay is measured between RETP and the ear simulator. See Annex L for appropriate measurement methods. Receive out-of-band signals Apply a sinewave signal at RETP at a level of –18.2 dBV, in the frequency range 300 to 3400 Hz. Measure the signal level at the ear simulator of any spurious tones that may appear between 4.6 kHz and 8.0 kHz. No weighting is applied to the result. For wideband applications, apply a sinewave signal at RETP in the frequency range of 150 to 6.7 kHz. At the ear simulator measure the level of any spurious tones that may appear from 7.2 kHz to approximately 8.5 kHz (seeF.8). The out-of-band signals shall be compared to the 1 kHz signal level at the ear simulator. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 57 IEEE P269/D25 October 2004 2373 2374 8.5 Send 2375 8.5.1 Send frequency response. 2376 2377 2378 2379 2380 Send frequency response is the ratio of voltage output at the send electrical test point (SETP) to the sound pressure at the Mouth Reference Point (MRP), which is expressed in decibels. The send frequency response in dB. HS(f), is given by Equation 8.3Equation 8.3Equation 8.2. The send frequency response, HS(f) may be used to calculate the send loudness rating (SLR) according to ITU-T Recommendation P.79-1999. Please see Annex H H S ( f ) 20 log 2381 2382 2383 2384 2385 2386 2387 2388 2389 2390 G SETP ( f ) G MRP ( f ) in dBV / Pa Equation 8.33210 where: GSETP(f) is the rms spectrum at SETP GMRP(f) is the rms spectrum at MRP. In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 2391 8.5.2 Send noise 2392 2393 2394 2395 2396 2397 2398 2399 2400 2401 2402 2403 2404 2405 2406 2407 Send noise is internally generated audio frequency noise present at the SETP. Connect the telephone set to the reference codec and place it in an active state with no acoustic input. Measure the electrical output signal at SETP, averaging over a minimum period of 5 seconds. The telephone microphone should be isolated from sound input and mechanical disturbances that would cause significant error. Send noise should be measured with the mute feature bot h“ on ”a n d“ of f . ” Psophometric measurements are made from 100 Hz to 3400 Hz for narrow band codecs, while A-weighted measurements are made from 100 Hz to 6800 Hz for wide band codecs. These measurements can be made directly using a psophometrically weighted or A-weighted noise meter with the correct terminating impedance. The measurement may also be implemented using a single-channel FFT with Hann windowing, or a real-time spectrum analysis, followed by a weighted power summation. 2408 8.5.3 2409 2410 2411 2412 2413 2414 2415 2416 2417 2418 2419 Narrow-Band noise, including single frequency interference (SFI), is an impairment that can be perceived as a tone depending on its level relative to the overall weighted noise level. This test measures the weighted noise level characteristics in narrow bands of not more than 31 Hz., These levels can then be compared to the send noise (8.5.2). The handset or headset should be isolated from sound input and mechanical disturbances that would cause significant error. Measure the psophometrically-weighted noise level at the SETP, using a selective voltmeter or spectrum analyzer, with an effective bandwidth of not more than 31 Hz, averaging over a minimum period of 5 seconds, over the frequency range of 100 to 3400 Hz for narrow band codecs. For wide band codecs, use Aweighting instead of psophometric weighting, over the frequency range of 100 to 6800 Hz. For narrow band codecs, send overall noise shall be measured and reported in units of dBmp. For wide band codecs, send overall noise shall be measured with A-weighting (defined in ANSI S1.4), reported in units of dBm(A). Measurements in dBmp and dBm(A) are generally not the same, and they may not be correlated. Send narrow-band noise I fFFTa n a l y s i si sus e d,t h e na“ Fl a tTop”wi n dows h a l lbee mpl oy e d. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 58 IEEE P269/D25 October 2004 2420 8.5.4 Send linearity 2421 2422 2423 2424 2425 2426 2427 2428 2429 2430 2431 2432 2433 2434 2435 2436 Send linearity is a measure of how the frequency response changes with input level. 2437 8.5.5 2438 2439 2440 2441 2442 2443 2444 2445 2446 2447 2448 2449 2450 The preferred distortion measurement method is send signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. For the narrow band codec, the stimulus bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus bandwidth is typically 100 to 6800 Hz. In all cases the analysis bandwidth is 100 Hz to 8500 Hz. 2451 8.5.6 2452 2453 2454 2455 2456 2457 2458 2459 2460 2461 2462 2463 2464 2465 2466 The mute function is for voice privacy during line hold and mute. Send muting is often manually controlled, but may be automatically controlled. Mute leakage is the amount of signal measured at the SETP when an acoustic stimulus is applied to the handset or headset microphone. 2467 8.5.7 2468 2469 2470 Delay is an important factor for digital telephones and network edge devices. It is a measure of the time taken for an excitation signal to traverse a given speech path for the device. Some devices may have delay in excess of 50 ms, as well as a variable delay or jitter. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 59 The test consists of measuring the send frequency response as specified in Clause 8.5.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus used to measure frequency response, except that the analysis bandwidth is different. For the narrow band codec, the analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the analysis bandwidth is typically 100 to 6800 Hz. If artificial voices or another wideband test signal are used, the test shall be performed at 7 levels from –34.7 dBPA to –4.7 dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies, at 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. Send distortion Send distortion is measured at SETP using the standard input level of –4.7 dBPa. Other input levels should be tested covering a range from –30 to +10 dBPa. Measurements should also be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 2% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Send mute leakage To measure mute leakage, engage the mute, apply the test signal, and measure the send noise according to clause 8.5.2. The test signal shall be the same as that used for send frequency response (8.5.1), at +5 dBPa. The result is expressed in dBmp, a weighted noise level which should be compared to muted broad-band noise measured according to 8.5.2 (with no stimulus). Note - If a sinusoidal stimulus was used to measure send frequency response in 8.5.1, the same sinusoidal frequency pattern shall be used for the mute measurement, but only over the range of 200-4000 Hz, at +5 dBPa. The absolute level at each frequency is measured, not the frequency response. Psophometric weighting should be applied to the result, expressed in dBmp as a function of frequency. The weighting permits more relevant comparison with results obtained with artificial voices. Send delay IEEE P269/D25 October 2004 2471 2472 2473 2474 2475 2476 Send delay is measured between the MRP and SETP. The electro-acoustic delay between the electrical input to the MRP and the microphone of the device should be considered unimportant. See Annex L for appropriate measurement methods. 2477 8.5.8 Send out-of-band susceptibility 2478 2479 2480 2481 2482 2483 2484 2485 2486 2487 2488 Send out-of-band susceptibility is a measure of signals that appear inside the specified frequency range for any input that is outside the specified frequency range. This test is designed to ensure that speech processing, coding, or compression, is properly implemented. 2489 8.5.9 2490 2491 2492 2493 2494 2495 2496 2497 2498 2499 2500 2501 Send frequency response in a diffuse field is a measure of how much of the noise in the room where a telephone is being used is transmitted to the network. It is the ratio of voltage output at the Send Electrical Test Point (SETP) to the sound pressure at the Diffuse Field Test Point (DFTP, see 5.5.3), which is expressed in decibels. The diffuse field send frequency response in dB, HSD(f), is given by equation Equation 8.5Equation 8.5Equation 8.3. Apply a sinewave signal at the MRP at a level of –4.7 dBPa, in the frequency range 4.5 kHz and 8.5 kHz. Measure the signal level at the SETP of any spurious tones that may appear between 300 to 3400 Hz. No weighting is applied to the result. For wideband applications, apply a sinewave signal at SETP in the frequency range of 7.1 kHz to 8.5kHz. At the SETP measure the level of any spurious tones that may appear from 100 to 6.8 kHz. Send frequency response in a diffuse field The diffuse field send frequency response may be sensitive to both the level and type of signal used. This measurement may be performed in 1/3 octave resolution. During the measurement, the mouth simulator is present but not active, with the MRP is located at the DFTP. The mouth simulator is not present during calibration. H SD ( f ) 20 log 2502 2503 2504 2505 2506 2507 2508 2509 2510 G SETP ( f ) G DFTP ( f ) in dBV / Pa Equation 8.55311 where: GSETP(f) is the rms spectrum at SETP GDFTP(f) is the rms spectrum at DFTP The cross-spectrum method is not recommended. 2511 8.5.10 Send signal-to-noise ratio 2512 2513 2514 Send signal-to-noise ratio is a measure of the desired speech transmission relative to unwanted noise in the room whe r et h et a l k e r ’ sph on ei sus e d.Se eAnnex K. 2515 8.6 2516 2517 Sidetone should be measured at minimum, reference, and maximum volume settings. Sidetone Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 60 IEEE P269/D25 October 2004 2518 8.6.1 2519 2520 2521 2522 2523 2524 2525 2526 2527 2528 Talker sidetone frequency response is the ratio of the sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to the sound pressure at the Mouth Reference Point (MRP), which is expressed in decibels. The talker sidetone frequency response in dB, HTS(f), is given by Equation 8.7Equation 8.7Equation 8.4. Talker sidetone frequency response may be used to calculate the sidetone masking rating (STMR) according to ITUT Recommendation P.79-1999. Please see Annex H. The STMR measured on an open-ear HATS is approximately 24 dB. This represents the effective floor of STMR measurements on actual telephones. H TS ( f ) 20 log 2529 2530 2531 2532 2533 2534 2535 2536 2537 2538 Talker sidetone frequency response G ERP ( f ) G MRP ( f ) in dBPa / Pa Equation 8.77412 where: GERP(f) is the rms spectrum at ERP GMRP(f) is the rms spectrum at MRP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 2539 8.6.2 2540 2541 2542 2543 2544 2545 2546 2547 2548 Listener sidetone is a measure of the signal present at the receiver due to sound in the room in which the receiver is used. The measurement is similar to talker sidetone, except that the stimulus signal is generated in the entire test room, and not presented from a mouth simulator. Listener sidetone frequency response is the ratio of the sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to the sound pressure from a diffused sound field at the DFTP (5.5.3), which is expressed in decibels. The listener sidetone frequency response in dB, HLS(f), is given by Equation 8.9Equation 8.9Equation 8.5. H LS ( f ) 20 log 2549 2550 2551 2552 2553 2554 2555 2556 2557 2558 2559 2560 2561 2562 2563 2564 2565 2566 Listener sidetone frequency response G ERP ( f ) GDFTP ( f ) in dBPa / Pa Equation 8.99513 where: GERP(f) is the rms spectrum at ERP GDFTP(f) is the rms spectrum of the diffuse sound field in the room at the DFTP The cross-spectrum method is not recommended. This measurement is conducted using a uniform diffuse sound field as specified in clause 5.5.3. This measurement may be performed in 1/3 octave resolution. The level of the test signal should be in the range of 40–65 dBA. The level and spectrum used should be reported. For measurement of listener sidetone, the handset or headset is mounted on an appropriate test fixture. The mouth simulator is present, but not active, with the MRP at the DFTP. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 61 IEEE P269/D25 October 2004 2567 8.6.3 Alternate method for listener sidetone 2568 2569 2570 2571 2572 2573 2574 2575 2576 For the alternate method, listener sidetone response HLS(f) is given approximately by Equation 8.11Equation 8.11Equation 8.6. It is the talker sidetone response HTS(f) minus the difference in send frequency responses from the standard near field method and a similar method using a diffuse noise signal. 2577 2578 2579 2580 2581 2582 2583 2584 2585 2586 Equation 8.1111614 To use this alternate method, measure the talker sidetone per 8.6.1, measure the send frequency response per 8.5.1, then measure the send frequency response in a diffuse field per 8.5.9, and apply Equation 8.11Equation 8.11Equation 8.6. H LS ( f ) H TS ( f ) [ H S ( f ) H SD ( f ) ] in dBPa / Pa where HTS(f) = Talker sidetone response HS(f) = Send frequency response, standard method HSD(f) = Send frequency response in a diffuse field CAUTION: This method may not be valid when the send, receive or sidetone path has nonlinear characteristics. 2587 8.6.4 Sidetone linearity 2588 2589 2590 2591 2592 2593 2594 2595 2596 2597 2598 2599 2600 2601 2602 2603 Sidetone linearity is a measure of how the frequency response changes with input level. 2604 8.6.5 2605 2606 2607 2608 2609 2610 2611 2612 2613 2614 2615 The preferred distortion measurement method is sidetone signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. The test consists of measuring the talker sidetone frequency response as specified in Clause 8.6.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus used to measure frequency response, except that the analysis bandwidth is different. For the narrow band codec, the analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the analysis bandwidth is typically 100 to 6800 Hz. If artificial voices or another wideband test signal are used, the test shall be performed at 7 levels from –34.7 dBPA to –4.7 dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies, at 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. Sidetone distortion Sidetone distortion is measured at ERP using the standard input level of –4.7 dBPa. Other input levels should be tested covering a range from –30 to +10 dBPa. Measurements also should be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 2% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 62 IEEE P269/D25 October 2004 2616 8.6.6 Sidetone delay 2617 2618 2619 Sidetone delay is measured between the mouth simulator and the ear simulator, using one of the methods described in Annex L. 2620 8.6.7 2621 2622 If round trip sidetone delay is more than 5 ms, sidetone echo response should be measured. See Annex M. 2623 8.7 Overall 2624 8.7.1 Overall frequency response 2625 2626 2627 2628 2629 2630 2631 2632 2633 2634 2635 2636 2637 2638 2639 The overall response should be measured using two telephone sets connected back-to-back, through the appropriate digital telephone interface, with or without the reference codec as necessary. Sidetone echo response Overall frequency response is measured on two telephones connected back-to-back, using the interface shown in Figure 17Figure 17Figure 17 of 8.2.1. The test conditions should be chosen according to 8.1, except that two test fixtures are used. In general, the test conditions should be the same as those used for send and receive measurements on the same telephone(s). Overall frequency response is the ratio of the sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), on the far-end telephone, to the sound pressure at the Mouth Reference Point (MRP) for the near-end telephone, which is expressed in decibels. The overall frequency response in dB, HO(f), is given by Equation 8.13Equation 8.13Equation 8.7. It may be used to calculate the overall loudness rating (OLR) according to ITU-T Recommendation P.79-1999. Please see Annex H. H O ( f ) 20 log 2640 2641 2642 2643 2644 2645 2646 2647 2648 2649 G ERP ( f ) G MRP ( f ) in dBPa / Pa Equation 8.1313715 where: GERP(f) is the rms spectrum at ERP GMRP(f) is the rms spectrum at MRP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 2650 8.7.2 Overall linearity 2651 2652 2653 2654 2655 2656 2657 2658 2659 2660 2661 2662 Overall linearity is a measure of how the frequency response changes with input level. The test consists of measuring the overall frequency response as specified in Clause 8.7.1 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus used to measure frequency response, except that the analysis bandwidth is different. For the narrow band codec, the analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the analysis bandwidth is typically 100 to 6800 Hz. If artificial voices or another wideband test signal are used, the test shall be performed at 7 levels from –34.7 dBPA to –4.7 dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 63 IEEE P269/D25 October 2004 2663 2664 2665 2666 If sine wave signals are used, they shall be applied at the R10 frequencies, at 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. 2667 8.7.3 2668 2669 2670 2671 2672 Overall distortion can be measured in a manner similar to sidetone distortion (8.6.5), except that the measurement is made from one set to another connected in a back to back configuration. For the narrow band codec, the stimulus bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus bandwidth is typically 100 to 6800 Hz. In all cases the analysis bandwidth is 100 Hz to 8500 Hz. 2673 8.8 2674 2675 2676 2677 2678 2679 2680 2681 2682 2683 Echo frequency response and TCLW are traditional means of evaluating echo in telephones (and also networks). For an alternative measure which may overcome certain shortcomings in this method, please see clause 8.9. Echo frequency response Echo frequency response is the ratio of the voltage output at the send electrical test point (SETP) to the voltage input at the receive electrical test point (RETP), expressed in dB. Echo response in dB, HE(f), is given by Equation 8.15Equation 8.15Equation 8.8. The inverse of this response is echo path loss, which may be used to calculate TCLW, the weighted terminal coupling loss, according to ITU-T Recommendation G.122 (1993) Annex B, Clause B.4 (trapezoidal rule). H E ( f ) 20 log 2684 2685 2686 2687 2688 2689 2690 2691 2692 2693 2694 2695 2696 2697 2698 2699 2700 2701 2702 2703 2704 2705 2706 2707 2708 2709 2710 2711 2712 Overall distortion G SETP ( f ) G RETP ( f ) in dBV / V Equation 8.1515816 where: GSETP(f) is the rms spectrum at SETP GRETP(f) is the rms spectrum at RETP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. Echo shall be measured under the following two conditions: a) Receiver placed on the same ear simulator used for receive frequency response measurements (8.4.1). b) Handset or headset is suspended in an anechoic chamber at least 500 mm from any reflecting objects. Echo may also be measured under the following two conditions: c) Receiver and microphone facing a hard, smooth surface free of any object for 500 mm. A headset is placed on the surface as if it was put down briefly by a user. d) In the reference corner of Figure 7Figure 7Figure 7 (5.6.1), with the receiver placed 250 mm from the corner. Telephone sets with adjustable receive volume controls shall be tested at the reference receive volume control setting. The recommended test signal for this test is the composite source signal, with a white spectrum for the noise part (CSS, see F.7.1). The recommended test signal level is –12.2 dBV (-10 dBm0). This level results in a relatively good signal to noise ratio for the measurement. The crest factor of CSS can be less than 10 dB, allowing more headroom than artificial voices. For devices that incorporate non-linear processes, additional measurements using signal levels Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 64 IEEE P269/D25 October 2004 2713 2714 2715 2716 2717 2718 of –8.2 dBV (–6 dBm0) and –18.2 dBV (–16 dBm0) may be performed. The measurement and calibration shall be determined duri n gt h e“ On ”por t i on soft h es i g n a l . 2719 8.9 2720 2721 2722 2723 2724 2725 2726 2727 2728 2729 2730 2731 2732 2733 2734 2735 2736 2737 2738 2739 2740 2741 2742 2743 2744 2745 2746 2747 2748 2749 2750 2751 2752 2753 2754 2755 2756 2757 2758 Temporally weighted terminal coupling loss (TCLT) is an alternative measure of echo which may overcome some shortcomings of echo frequency response and TCLW , the traditional means of evaluating echo in telephones (and also networks). There can be two problems with echo frequency response and TCLW: 2759 8.10 2760 2761 2762 2763 2764 The stability measurement is the same as echo (8.8) except the test signal is a sinewave at an input level greater than or equal to –12.2 dBV (-10 dBm0) and less than or equal to –2.2 dBV (0 dBm0), at one-twelfth octave intervals (or R40) for frequencies from 200 Hz to 4 kHz. Stability loss is the maximum value of the inverse of echo (Equation 8.15Equation 8.15Equation 8.8). The measurement is performed under all four physical configurations specified in 8.8. For the narrow band codec, the stimulus and analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus and analysis bandwidth is typically 100 to 6800 Hz. Temporally weighted terminal coupling loss a) If the echo is low enough in level, the signal-to-noise ratio of the measurement can be poor or even negative. In such a case, it may not be clear if a measured result is echo or noise. b) The results obtained may not correlate well with perception, particularly if the echo comes in bursts. The temporally weighted terminal coupling loss method is described in Annex O, and an algorithm is given in Annex P. Several results are available from this method, but long-term temporally weighted terminal coupling loss, single talk (LTCLT ) is recommended for single-number description of telephone echo. LTCLT is comparable to TCLW, except that it incorporates psychoacoustic factors and separates echo from noise. The test signal is real speech (F.6.3), with pauses edited so they are less than 20ms. Synthesized real speech (F.6.2) may also be suitable, but has not yet been validated. The test level is –18.2 dBV, measured during the active portions of the speech signal. The test signal is applied at the RETP for 30 seconds so that the telephone reaches its steady state. No signal other than the acoustic return from the receiver is applied to the microphone. Record the electrical signals at RETP and SETP for the next 1 minute. Align the RETP and SETP signals in time by adding delay equal to EPD (echo path delay) to the RETP signal. LTCLTis the difference (in dB) between the signal level at RETP and SETP calculated using the algorithm in Annex P. LTCLT shall be measured under the following two conditions: a) Receiver placed on the same ear simulator used for receive frequency response measurements (8.4.1). b) Handset or headset is suspended in an anechoic chamber, at least 500 mm from any reflecting objects. LTCLT may also be measured under the following two conditions: c) Receiver and microphone facing a hard, smooth surface free of any object for 500 mm. A headset is placed on the surface as if it was put down briefly by a user. d) In the reference corner of Figure 7Figure 7Figure 7 (5.6.1), with the receiver placed 250 mm from the corner. Telephone sets with adjustable receive volume controls shall be tested at the reference receive volume control setting. Stability loss Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 65 IEEE P269/D25 October 2004 2765 2766 2767 2768 2769 2770 2771 For the narrow band codec, the stimulus and analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus and analysis bandwidth is typically 100 to 6800 Hz. During the measurements, the operator should monitor the telephone for any sign of howling, whistling or other signs of instability. 2772 8.11 Convergence time 2773 2774 2775 2776 2777 2778 2779 2780 2781 2782 2783 2784 2785 Some devices may have a nonlinear process, such as an echo canceller, to improve TCLw.. The convergence time is a measure of how fast the full attenuation of the echo signal is achieved. 2786 8.12 2787 2788 2789 2790 2791 2792 2793 2794 2795 2796 2797 2798 2799 2800 2801 2802 2803 2804 2805 Discontinuous speech transmission (DTX) is often featured as a voice/speech activity detector (VAD/SAD) that detects when the speech path is idle in a particular direction. The system will then mute the speech path, allowing additional bandwidth for data traffic. 2806 8.12.1 2807 2808 2809 2810 The receive comfort noise of a digital telephone is the short-term average background noise level measured at the output of the telephone receiver, with the digital telephone receiving either a silence indication packet from the transmitting telephone, or no packets from the transmitting telephone, for some non-transient period of time. 2811 8.12.2 2812 2813 Telephone sets with adjustable receive levels shall be adjusted as close as possible to the reference receive volume control setting. Use the same ear simulator and positioning which was used for receive measurements (8.4). To measure convergence time, reset the device to a nominal state by initiating a new call in a quiet environment of less than 30 dBA. Trigger a time capture with the onset of the input signal at RETP for a duration of 1 second. Capture the trigger signal at RETP and the return signal at SETP. The convergence time is taken from the onset of the trigger signal at RETP to where 90% of full echo path loss is achieved at SETP. If the canceller does not appear to converge inside of 1 second, a longer time capture may be needed. CSS at –12.2 dBV is the preferred test signal for this measurement. (F.7.1) For the narrow band codec, the stimulus and analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus and analysis bandwidth is typically 100 to 6800 Hz. Discontinuous speech transmission DTX may cause noise pumping, and both front end speech and trailing speech clipping, especially if the device has its own VAD feature working in tandem with a network DTX. If the device has its own VAD feature, this can be characterized by measuring comfort noise matching, speech detection switching time, and hangover switching time. Techniques to characterize switching times, can be found in IEEE Std. 1329, clause 10. Comfort noise matching is a comparison of background or network noise levels heard during active speech transmission, and inserted replacement noise once the speech path is discontinued. The comfort noise level introduced to replace the actual background noise should roughly match the loudness as perceived by the user of the original background noise. This level matching is subjectively asymmetric, in that there is more likely to be annoyance in the comfort noise loudness being greater than the original noise than in being less than the original. General Measurement method Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 66 IEEE P269/D25 October 2004 2814 2815 2816 2817 2818 2819 2820 2821 2822 2823 2824 2825 2826 2827 2828 2829 2830 2831 2832 2833 2834 2835 2836 2837 For the narrow band codec, the stimulus and analysis bandwidth is 100 to 3400 Hz. For the wideband codec, the stimulus and analysis bandwidth is typically 100 to 6800 Hz. With both VAD disabled at the transmitting source and comfort noise generation on the receiving unit under test turned off, a band-limited white noise test signal should be sent from the transmitting end such that the receive noise l e v e lme a s u r e da tt h er e c e i v i ngt e l e ph on ei s48dBA.Th i st e s ts i g n a l ,a tt h i sl e v e l ,wi l lbea s s i gn e dt h el e v e lof‘ N dB’a sac a l i br a t e dpoi n tf ort h epu r pos eoft h ec omf or tn oi s et e s t ,s i n c ei tma y be generated either as an acoustic s i gn a la ta‘ g ol de n’t r a ns mi t t i ngt e l e ph on e( a n dme a s u r e di ndBA) ,ori n j e c t e ddi g i t a l l y( a ndme a s u r e di ndBm0p) . If it is not possible to disable the VAD, then a band-limited white noise signal at –62.2 dBV (–60 dBm0) is input at RETP with a –12.2 dBV (-10 dBm0), 1 kHz tone. The injected noise level is measured at the receiver, with the 1 kHz tone filtered out. Remove the 1k Hz tone, and, once the device has discontinued the speech path, measure the generated comfort noise. Th ef ol l owi ngt e s ts e qu e n c emus tbef ol l owe df ora l lc a l i br a t e dt e s tn oi s el e v e l sof‘ M dB’whi c hwi l lr a n g ef r omN10 to N+10 dB. a) The echo canceller at both ends should be disabled b) 10 seconds of silence (or idle code) is inserted at the transmitting point c) Band-limited white noise of level M dB is inserted at the transmitting point for 130 seconds d) During the final 10 seconds of level M noise insertion, the acoustic noise level at the receive will be measured e) Steps b)-d) are repeated for varying M in 1 dB gradations 2838 8.13 Maximum acoustic output 2839 2840 2841 2842 2843 2844 2845 2846 2847 2848 2849 2850 2851 The testing methods provided in this clause only cover the application of in-band signals, but the same sound pressure limits may apply if ringing signals appear in the handset or headset receiver with the telephone set in offhook conditions. See Annex N for a discussion of maximum pressure limits. 2852 8.13.1 2853 2854 2855 2856 2857 2858 2859 2860 2861 2862 2863 2864 2865 2866 The maximum acoustic pressure is the maximum steady state sound pressure emitted from a receiver. The measurement shall be made with real-time filter analysis (RTA) in 1/12 octave bands, described in G.3. The detector shall be set to rms fast, which is a 250ms effective averaging time (equivalent to a 125ms time constant). The detector shall be set to hold the maximum level achieved in each band during the entire sweep. Maximum acoustic output measurements shall be made on the same ear simulator and with the same positioning and force as used for receive frequency response measurements. For handsets measured on HATS, an additional measurement with a force of 13N is required. See 5.3.2 for handsets, 5.3.3 for headsets. Telephone sets with adjustable receive volume controls shall be adjusted to the maximum setting. Acoustic output can be referenced to the ERP, DRP, free field (0 degrees elevation and azimuth), or to a diffuse field, as required by the appropriate safety standard. This may require that measurements made at one reference point be translated to the required reference point. A filter may be required. See Annex C. Maximum acoustic pressure (long duration) Additional consideration should be given to the acoustic pressure caused by tones, other audio signals or long duration, high amplitude electrical signals applied to power, network, or auxiliary leads of the digital telephone. For digital telephones, the long duration acoustic pressure shall be determined by applying digital codes to the receive input. This may be performed by using an analogue test set to drive a reference codec or by use of a digital code generator. If a set other than a G.711 type set is to be tested, then an analogue codec should be used. The analog level shall be set to switch between the maximum positive and the maximum negative values for the reference codec. The switching rate shall sweep through the range of 100 Hz to 3400 Hz for narrowband and 100 Hz to 6800 Hz for wideband. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 67 IEEE P269/D25 October 2004 2867 2868 2869 2870 2871 2872 2873 2874 2875 If a G.711 type of set is to be tested, a digital generator may be used. In this case, the codes shall be switched between the maximum positive and the maximum negative values, defined in ITU-T Recommendation G.711 (viz. +3.17 dBm0 for mu-law coding and +3.14 dBm0 for A-law coding). The switching rate shall sweep through a range of 100 Hz to 3400 Hz for narrowband and 100 Hz to 6800 Hz for wideband. The sweep time shall be at least 90 seconds. A sweep time should be selected that provides consistent results with no underestimation. That is, the result should be within 0.5 dB at all frequencies for a test period ± 30 seconds. 2876 8.13.2 Peak acoustic pressure (short duration) 2877 2878 2879 2880 2881 2882 2883 2884 2885 2886 2887 2888 2889 2890 2891 2892 2893 2894 2895 2896 2897 2898 2899 2900 2901 2902 2903 2904 2905 2906 The peak acoustic pressure is the maximum unweighted peak sound pressure emitted from a telephone receiver. The stimulus for this test is a series of very short sweeps applied at RETP. The short sweeps are to avoid activating any long-term non-linear processes, such as AGC, that may be operating in the device. The measurement shall be ma dea tt h ee a rs i mu l a t orwi t ha nunwe i gh t e d“ pe a kh ol d”l e v e lde t e c t or having a rise time equal to or less than 50 µs. Additional consideration should be given to the peak acoustic pressure caused by tones or short duration, high amplitude electrical pulses applied to power, network, or auxiliary leads of the digital telephone. For digital telephones, the short duration acoustic pressure shall be determined by applying digital codes to the receive input. This may be performed by using an analog test set to drive a reference codec, or by use of a digital code generator. If a set other than a G.711 type set is to be tested, then an analog codec should be used. The analog level shall be set to switch between the maximum positive and the maximum negative values for the reference codec. The switching rate shall sweep through the range of 100 Hz to 3400 Hz for narrowband and 100 Hz to 6800 Hz for wideband. If a G.711 type of set is to be tested, a digital generator may be used. In this case the codes shall be switched between the maximum positive and the maximum negative values, defined in ITU-T Recommendation G.711 (viz. +3.17 dBm0 for mu-law coding and +3.14 dBm0 for A-law coding). The switching rate shall sweep through a range of 100 Hz to 3400 Hz for narrowband and 100 Hz to 6800 Hz for wideband. The duration of the ON codes shall be a number of complete cycles approximating but not exceeding 500 ms. The ON codes must be followed by a quiet interval of at least 500 ms before repeating the codes, as shown in Figure 18 Figure 18 Figure 18. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 68 IEEE P269/D25 October 2004 250 on 500 ms 500 ms maximum positive digital word maximum negative digital word 2907 2908 2909 2910 2911 2912 2913 Figure 18 - On/Off Time for Short Duration Peak Acoustic Pressure NOTE –It is advisable to repeat some tests more than one time, to ensure that the protection system is not damaged. 2914 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 69 IEEE P269/D25 October 2004 2914 9 Test Procedures for Analog 4-wire Handsets and Headsets 2915 9.1 General 2916 2917 2918 2919 2920 2921 2922 2923 2924 2925 2926 2927 2928 2929 2930 2931 2932 2933 2934 2935 2936 2937 Procedures are given in this clause for measurement of send and receive performance characteristics of handsets and headsets tested as 4-wire devices, which are not connected to a complete telephone. Parameters include frequency response, noise, input-output linearity, distortion, ac impedance, and dc resistance. In addition, procedures are given for measuring echo frequency response and maximum acoustic output. 2938 9.1.1 2939 2940 2941 2942 2943 2944 2945 2946 2947 2948 2949 2950 2951 2952 2953 2954 2955 2956 2957 In general, multiple test signals and stimulus levels should be used to ensure the handset or headset is characterized in realistic, stable and well-defined states. This is especially the case for devices with non-linear processes such as compression or voice activated switching (VOX) circuitry, etc. See Annex F & Annex G for further information on test signals and analysis methods. 2958 9.1.2 2959 2960 2961 2962 The measurement shall be performed using the same format as was used for calibration. Format examples are 1/N octave bandwidth analysis, constant bandwidth analysis and R-series preferred frequencies. Measurement bandwidth shall be the same as or less than that which was used for calibration. Measurement resolution shall be the same as or coarser than that which was used for calibration. The actual bandwidth used shall be stated. Loudness ratings (RLR and SLR) should not be used for 4-wire handsets and headsets as they are only defined for complete telephone systems. It is possible to calculate loudness ratings for handsets and headsets, but the results can only be used to compare similar devices since they are not generally meaningful. In this case the numbers shall be r e f e r r e dt oa s“ r e l a t i v eRLR”or“ r e l a t i v eSLR” . The handset or headset shall be connected to the appropriate test circuit(s) described in clause 9.2. Other test circuits may be used for specific applications. Because 4-wire devices are affected by changes in voltage, current and impedance, the measurements should be made over the conditions that are expected in actual use. Records should be kept of the measurement conditions. The measured frequency responses shall be presented as decibels relative to one pascal per volt [dB (Pa/V)] for receive, decibels relative to one volt per pascal [dB (V/Pa)] for send, and decibels relative to one volt per volt [dB (V/V)] for echo. The stimulus level and signal type shall be reported for each test. The calibration procedures described in clause 6 shall be carried out before making any measurements. The acoustical test environment shall meet the specifications given in clause 5.5. Choice of test signals and levels The standard test signal for all handsets and headsets consists of artificial voices defined in ITU-T Recommendation P.50. See (F.6.1.1) for details. Sinusoidal test signals may be used for testing handsets or headsets if it can be shown that they do not have adaptive, nonlinear or dynamic signal processing (e.g. compressors, AGC, voice activity detection, adaptive echo cancellers, etc.). Such evidence must be given in the test report if sinusoidal test signals are used. Other test signals may be used when it can be shown that they produce results consistent with actual use. They also may be necessary for some specific purposes as discussed in relevant places within this standard. The measurements in this clause shall be performed at the standard test level for send specified in 6.7.2, and at the receive stimulus level determined by the procedure in 9.3.2. Measurement bandwidth and resolution Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 70 IEEE P269/D25 October 2004 2963 2964 2965 2966 In general, the test signals and analysis methods in this standard cover a frequency range from approximately 100 to 8500 Hz. The exact range depends on the analysis method, and the test signal (see G.6 and G.7) 2967 9.1.3 2968 2969 2970 2971 Choose the ear simulator, mouth simulator and test position according to clauses 5.1, 5.2 and 5.3. This equipment shall be used for all tests described in clause 9, unless otherwise specified. The ear simulator, mouth simulator, and test position used shall be stated. 2972 9.1.4 2973 2974 2975 2976 2977 2978 2979 2980 I ft h eh a n ds e torh e a ds e ti se q u i ppe dwi t hat on ec on t r ol ,t het on ec on t r ols h a l lbes e tt ot h ema n uf a c t u r e r ’ sde f a u l t setting. This is the default tone control adjustment that shall be used for all measurements. 2981 9.1.5 2982 2983 2984 2985 2986 All measurements shall be done at the default receive volume control setting (9.3.2) and default send gain adjustment (9.4.1). These default settings for handsets and headsets are defined differently than the reference receive volume control setting for complete telephones. A range of control settings may also be used where appropriate, such as minimum and maximum. 2987 9.2 2988 2989 2990 2991 2992 The test circuits are terminated into an load greater than 100 k. This termination is the send electrical test point (SETP) for measuring send output signals. This same termination is also the receive electrical test point (RETP) for applying receive input signals. Note, other terminating loads may be substituted as defined by applicable performance specifications. Choice of ear and mouth simulators and test position Tone control setting If no default setting is defined by the manufacturer, the tone control shall be set so that the frequency response is as close as possible to the center of the required frequency response template. The tone control shall be set before setting the volume control. If the tone and volume controls interact, an iterative process for setting these controls may be necessary. Default receive volume control and send gain adjustment Handset and headset test circuits R1 Microphone C R2 + V 2993 2994 2995 2996 2997 Figure 19 Electret Microphone Test Circuit Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 71 Send Electrical Test Point (SETP) IEEE P269/D25 October 2004 Microphone 2998 2999 3000 3001 Send Electrical Test Point (SETP) R2 Figure 20 Dynamic Microphone Test Circuit C R1 + V Microphone R2 D 3002 3003 3004 3005 3006 3007 3008 3009 3010 3011 3012 3013 3014 3015 3016 3017 3018 3019 3020 Send Electrical Test Point (SETP) L Figure 21 Carbon Microphone Test Circuit In the microphone test circuits, Figure 19Figure 19Figure 19, Figure 20Figure 20Figure 20 and Figure 21Figure 21Figure 21, the values for voltage V, capacitance C, resistances R1 and R2, inductance L and diode D should simulate the range of operating parameters of the headset or handset interface. These values are intended to provide support for both DC and AC characteristics. The effective load impedance provided by these test circuits shall be equal to the range of operating impedances of the headset or handset interface. For electret microphones, the effective load impedance ZL = (R1 x R2) / (R1 + R2). This assumes C is large enough so that its impedance is small compared to R1 and R2 at the lowest frequency tested. In many cases, R2 is infinite, so the effective load impedance ZL = R1. In the case of a completely self-powered microphone system, or a microphone system powered by its intended host, the circuit of Figure 20Figure 20Figure 20 may be used. The microphone should be connected to its intended host or suitable simulation. ZS (Z TERM ) 3021 3022 3023 3024 3025 3026 3027 3028 Receive Electrical Test Point (RETP) Z S Ohm s Receiver or Receiver System Figure 22 Receiver Test Circuit (ZTERM 100 kohm, used for calibration only) The effective impedance ZS in the receiver test circuit of Figure 22 Figure 22 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 72 IEEE P269/D25 October 2004 3029 3030 3031 3032 3033 3034 3035 3036 Figure 22 shall be equal to the specified nominal impedance of the receiver under test. ZS should take into account both the output impedance of the signal generator and any other added impedances. In case of a receiver system which needs to be powered, the headset or handset should be connected to its intended host or suitable simulation. The circuit of Figure 23Figure 23Figure 23 may be used for measurement of DC characteristics. A Microphone or Receiver 3037 3038 3039 3040 3041 DC Am m eter R DC Voltm eter V + V Figure 23 DC Characteristics Test Circuit 3042 9.3 Receive 3043 9.3.1 General 3044 3045 3046 3047 3048 3049 Receive characteristics of handsets and headsets are measured with the receiver sound port terminated in the appropriate ear simulator, as defined in Clause 5. 3050 9.3.2 3051 3052 3053 3054 3055 3056 3057 3058 3059 3060 3061 3062 3063 3064 3065 3066 3067 3068 I fah e a ds e torh a n ds e ti se qu i ppe dwi t har e c e i v ev ol umec on t r ol ,i ts h a l lbes e tt ot h ema nu f a c t u r e r ’ sde f a u l ts e t t i ng . For frequency response measurements, LRETP shall be adjusted so that LERP = –14 dBPa. Receive measurements should be taken with the handset or headset driven from a source equivalent to the interface circuitry as specified in Clause 9.2. Receive volume control adjustment If no default setting is defined by the manufacturer, the following procedure shall be followed to determine the default receive volume control setting, using the test signal chosen for subsequent receive measurements. If a sine wave signal is used, the frequency shall be 1 kHz: a) Set the volume control to maximum. Adjust LRETP so that LERP = –14 dBPa. Record this level and call it LMAX. b) Set the volume control to minimum. Adjust LRETP so that LERP = –14 dBPa. If this is not possible, move the control up slightly. Record this level and call it LMIN. c) Calculate the halfway point in dB between LMIN and LMAX, and call it LMID. Set LRETP to LMID. This value of LRETP shall be used for frequency response measurements. Adjust the volume control so that LERP = –14 dBPa. This is the default receive volume control setting which shall be used for all measurements unless otherwise specified. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 73 IEEE P269/D25 October 2004 3069 9.3.3 Receive frequency response 3070 3071 3072 3073 Receive frequency response is the ratio of sound pressure measured in the ear simulator, referred to the Ear Reference Point (ERP), to voltage input at the receive electrical test point (RETP), which is expressed in decibels. The receive frequency response in dB, HR(f), is given by Equation 9.1Equation 9.1Equation 9.1. H R ( f ) 20 log 3074 3075 3076 3077 3078 3079 3080 3081 3082 3083 G ERP ( f ) G RETP ( f ) in dBPa / V Equation 9.117 where: GERP(f) is the rms spectrum at ERP GRETP(f) is the rms spectrum at RETP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 3084 9.3.4 Receive noise 3085 3086 3087 3088 3089 3090 3091 3092 3093 3094 3095 Receive noise is internally generated audio frequency noise present at the handset or headset receiver when no stimulus is applied. The receiver shall be coupled to the ear simulator with the RETP terminated and with no signal input. The handset or headset microphone should be isolated from sound input and mechanical disturbances that would cause significant error. Measure the acoustic output signal, referred to the ERP, from 25100 to 8,500 Hz, averaging over a minimum period of 5 seconds. Receive noise should be measured with the send mute feature both “ on ”a n d“ of f . ” 3096 9.3.5 3097 3098 3099 3100 3101 3102 3103 3104 3105 3106 Receive narrow-band noise, including single frequency interference (SFI), is an impairment that can be perceived as a tone relative to the overall weighted noise level. This test measures the weighted noise level characteristics in narrow bands of not more than 31 Hz maximum, from 100 25 to 8,500 Hz. These levels can then be compared to the receive noise (9.3.4). 3107 9.3.6 3108 3109 3110 3111 3112 3113 3114 3115 3116 Receive linearity is a measure of how the frequency response changes with input level. The receive noise level is measured with A-weighting in dBA. The measurement may be implemented directly using an A-weighting filter, or by using single-channel FFT with Hann windowing or real-time spectrum analysis, followed by an A-weighted power summation. Receive narrow-band noise The receiver shall be coupled to the ear simulator with the RETP terminated and with no signal input. Measure the A-weighted receive noise level, referred to the ERP, using a selective voltmeter, or a spectrum analyzer with an effective bandwidth of not more than 31 Hz, over the frequency range of 100 25 to 8,500 Hz, averaging over a minimum period of 5 seconds. If FFT analysis is use d,t h e n“ Fl a tTop”wi n dowi ngs h a l lbee mpl oy e d. Receive linearity The test consists of measuring the receive frequency response as specified in Clause 9.3.3 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus type used to measure frequency response. The default receive volume and tone control setting shall be used. If artificial voices or another wideband test signal are used, the test shall be performed in 1/3 octave bands. If sine wave signals are used, they shall be applied at the R10 frequencies from 200 through 5000 Hz. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 74 IEEE P269/D25 October 2004 3117 3118 3119 3120 3121 For any test signal, the reference stimulus level is LMID, as determined according to the procedure in 9.3.2. The test shall be performed at 7 levels, from LMID –15 dB to LMID + 15 dB, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. 3122 9.3.7 3123 3124 3125 3126 3127 3128 3129 3130 3131 3132 3133 3134 The preferred distortion measurement method is receive signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. 3135 9.3.8 3136 3137 3138 Mount the receiver to the appropriate ear simulator. Connect an impedance bridge to the receive circuitry described in clause 9.2. Measure the impedance at each frequency of interest. 3139 9.3.9 3140 3141 3142 3143 The resistance of the receive circuit should be obtained by the current-voltage method shown in Figure 23Figure 23Figure 23. This measurement may be taken for various dc supply voltages, but use caution to avoid damaging the receive circuitry. 3144 9.4 3145 9.4.1 3146 3147 3148 3149 3150 3151 3152 3153 3154 3155 3156 3157 3158 3159 3160 3161 3162 3163 I fah e a ds e torh a n ds e ti se qui ppe dwi t has e n dg a i na dj u s t me nt ,t h eg a i nc on t r ols h a l lbes e tt ot h ema nuf a c t u r e r ’ s default setting. This is the default send gain control adjustment that shall be used for send frequency response measurements. Receive distortion Receive distortion is measured at ERP using an input level of LMID, as determined according to the procedure in 9.3.2. Other input levels should be tested covering a range of at least from –30 to +5 dBV and above, if necessary, until obvious clipping or limiting occurs. Measurements should also be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 1% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. AC impedance DC resistance Send Send gain control adjustment If no default setting is defined by the manufacturer, the following procedure shall be followed to determine the default send gain control setting, using the test signal chosen for subsequent send measurements. If a sinewave signal is used, the frequency shall be 1 kHz: a) Set the gain adjustment to maximum. Set LMRP to –4.7 dBPa, then measure LSETP. Record this level and call it LMAX. b) Set the gain adjustment to minimum. Set LMRP to –4.7 dBPa, then measure LSETP. Record this level and call it LMIN. If this is not possible, move the control up slightly, then repeat the procedure. c) Calculate the halfway point in dB between LMAX and LMIN, and call it LMID. Set LMRP to –4.7 dBPa, then measure LSETP Adjust the send gain control so that LSETP = LMID. This is the default send gain control adjustment that shall be used for all measurements unless otherwise specified. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 75 IEEE P269/D25 October 2004 3164 9.4.2 Send frequency response 3165 3166 3167 3168 Send frequency response is the ratio of voltage output at the Send Electrical Test Point (SETP) to the sound pressure at the Mouth Reference Point (MRP) , which is expressed in decibels. The send frequency response in dB, HS(f), is given by Equation 9.3Equation 9.3Equation 9.2. H S ( f ) 20 log 3169 3170 3171 3172 3173 3174 3175 3176 3177 3178 3179 3180 G SETP ( f ) G MRP ( f ) in dBV / Pa Equation 9.33218 where: GSETP(f) is the rms spectrum at SETP GMRP(f) is the rms spectrum at MRP. In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. 3181 9.4.3 Send noise 3182 3183 3184 3185 3186 3187 3188 3189 3190 3191 3192 3193 3194 3195 3196 Send noise is internally generated audio frequency noise present at the microphone terminals or circuitry with no stimulus applied. Measure the electrical output signal at SETP, averaging over a minimum period of 5 seconds. The handset or headset microphone should be isolated from sound input and mechanical disturbances that would cause s i gn i f i c a n te r r or .Se n dn oi s es h ou l dbeme a s u r e dwi t ht h emu t ef e a t u r ebot h“ on ”a n d“ of f . ” 3197 9.4.4 3198 3199 3200 3201 3202 3203 3204 3205 3206 3207 Send narrow-band noise, including single frequency interference (SFI), is an impairment that can be perceived as a tone relative to the overall weighted noise level. This test measures the A-weighted noise level characteristics in narrow bands, of not more than 31 Hz maximum, from 100 25 –8500 Hz. 3208 9.4.5 3209 3210 Send linearity is a measure of how the frequency response changes with input level. Send overall noise shall be measured with psophometric weighting, and reported in units of dBV(p). It shall also be measured with A-weighting and reported in units of dBV(A). Measurements in dBV(p) and dBV(A) are generally not the same, and they may not be correlated. Units of dBmp or dBm(A) can then be calculated based on the method described in Annex T. Psophometric measurements are made from 10025-6000 Hz, while A-weighted measurements are made from 10025-8,500 Hz.. These measurements can be made directly using a psophometrically weighted or A-weighted noise meter with the correct terminating impedance. The measurement may also be implemented using a single-channel FFT with Hann windowing, or a real-time spectrum analysis, followed by a weighted power summation. Send narrow-band noise The handset or headset should be isolated from sound input and mechanical disturbances that would cause significant error. Measure the A-weighted noise level across R2 with a selective voltmeter, or a spectrum analyzer with an effective bandwidth of not more than 31 Hz, over the frequency range of 100 25 to 8500 Hz, averaging over a minimum period of 5 seconds.I fFFTa n a l y s i si sus e d,t h e n“ Fl a tTop”wi n dowi ngs h a l lbee mpl oy e d. The same procedure may be applied, but with psophometric weighting, if specified by a performance standard. Send linearity Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 76 IEEE P269/D25 October 2004 3211 3212 3213 3214 3215 3216 3217 3218 3219 3220 3221 3222 3223 The test consists of measuring the send frequency response as specified in Clause 9.4.2 and applying the procedures described in Annex I. Linearity shall be measured using the same test method and stimulus type used to measure frequency response. 3224 9.4.6 3225 3226 3227 3228 3229 3230 3231 3232 3233 3234 3235 The preferred distortion measurement method is send signal-to-distortion-and-noise ratio (SDN), measured using narrow-band pseudo-random noise as the stimulus. See A.1.1J.3 for details of the method. 3236 9.4.7 3237 3238 3239 3240 3241 3242 3243 3244 3245 3246 3247 3248 Send frequency response in a diffuse field is a measure of how much of the noise in the room where a telephone is being used is transmitted to the network. It is the ratio of voltage output at the Send Electrical Test Point (SETP) to the sound pressure at the Diffuse Field Test Point (DFTP, see 5.5.3), which is expressed in decibels. The diffuse field send frequency response in dB, HSD(f), is given by equation Equation 9.5Equation 9.5Equation 9.3. If artificial voices or another wideband stimulus are used, the test shall be performed at 7 levels, from –34.7 dBPA to –4.7 dBPa, in 5 dB intervals, measured in 1/3 octave bands. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –4.7 dBPa. These levels take into account the high crest factor of artificial voices, which approaches 23 dB. If sine wave signals are used, they shall be applied at the R10 frequencies from 200 through 5000 Hz for 7 levels, from –24.7 to +5.3 dBPa, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level is –9.7 dBPa. Send distortion is measured using the standard input level of –4.7 dBPa. Other input levels should be tested covering a range from –30 to +10 dBPa. Measurements should also be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies. For higher input levels, verify that distortion of the test system is less than 2% THD. For information about THD and other distortion measurement methods and test signals, and the conditions under which they may be used, see Annex J. Different distortion measurement methods are likely to give different results. Send frequency response in a diffuse field The diffuse field send frequency response may be sensitive to both the level and type of signal used. This measurement may be performed in 1/3 octave resolution. During the measurement, the mouth simulator is present but not active, with the MRP is located at the DFTP. The mouth simulator is not present during calibration. H SD ( f ) 20 log 3249 3250 3251 3252 3253 3254 3255 3256 3257 Send distortion G SETP ( f ) G DFTP ( f ) in dBV / Pa Equation 9.55319 where: GSETP(f) is the rms spectrum at SETP GDFTP(f) is the rms spectrum at DFTP The cross-spectrum method is not recommended. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 77 IEEE P269/D25 October 2004 3258 9.4.8 Send signal-to-noise ratio 3259 3260 3261 Send signal-to-noise ratio is a measure of the desired speech transmission relative to unwanted noise in the room whe r et h et a l k e r ’ sph on ei sus e d.Se eAnnex K. 3262 9.4.9 3263 3264 3265 3266 3267 3268 Connect the headset or handset receiver according to Figure 19Figure 19Figure 19, Figure 20Figure 20Figure 20 or Figure 21Figure 21Figure 21. Temporarily disconnect R2 and measure the electrical output for an input level representing the magnitude of typical voice signals. Connect R2 and adjust its resistance to cause a 6 dB drop in output voltage level. This resistance value is the magnitude of the impedance of the microphone circuit, which may include R1, at each frequency of interest. 3269 9.4.10 3270 3271 3272 3273 3274 The resistance of a dynamic type microphone can be measured directly. The resistance of electret and carbon type microphones should be obtained from the current-voltage characteristics. This measurement may be taken for various dc supply voltages, but use caution to avoid damaging the microphone circuitry. The microphone should be isolated from sound input and mechanical disturbances for these measurements. 3275 9.5 3276 3277 3278 3279 3280 3281 3282 3283 3284 3285 3286 3287 3288 3289 Echo frequency response is the ratio of the voltage output at the send electrical test point (SETP) to the voltage input at the receive electrical test point (RETP), expressed in dB. Echo response in dB, HE(f), is given by Equation 9.7Equation 9.7Equation 9.4. The inverse of this response is echo path loss. AC impedance DC resistance Echo frequency response Echo path loss may be used to calculate TCLW, the weighted terminal coupling loss, according to ITU-T Recommendation G.122 (1993) Annex B, Clause B.4 (trapezoidal rule). For handsets and headsets this calculation s h a l lbel a be l e da s“ r e l a t i v eTCLW, ”s i n c et r u eTCLW is defined only for complete telephones. TCLW may be normalized to nominal RLR and SLR target specifications, corrected from relative SLR and relative RLR.I ts h a l lt h e nbel a be l e d“ n or ma l i z e dTCLW, ”a n dt h eme t h odofn or ma l i z a t i ons hall be stated. H E ( f ) 20 log 3290 3291 3292 3293 3294 3295 3296 3297 3298 3299 3300 3301 3302 3303 3304 3305 G SETP ( f ) G RETP ( f ) in dBV / V Equation 9.77420 where: GSETP(f) is the rms spectrum at SETP GRETP(f) is the rms spectrum at RETP In some cases, frequency response calculation may be performed with cross-spectrum or related techniques. Justification for such techniques shall be given in the test report. See clause G.1 for more information. Echo frequency response shall be measured under the following two conditions: a. b. Receiver placed on the same ear simulator used for receive measurements (9.3). Handset or headset is suspended in the anechoic chamber at least 500 mm from any reflecting objects. Echo frequency response may be measured under the following two conditions: Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 78 IEEE P269/D25 October 2004 3306 3307 3308 3309 3310 3311 3312 3313 3314 3315 3316 3317 c. d. Receiver and microphone facing a hard, smooth surface free of any object for 500 mm. Handset receiver and microphone facing down. Headset is placed on the surface as if it was put down briefly by a user. In the reference corner of Figure 7Figure 7Figure 7 in clause 5.6.1, with the receiver placed 250 mm from the corner. The recommended test signal for this test is the composite source signal, with a white spectrum for the noise part (CSS, see F.7.1). The recommended test signal level is LMID + 6 dB. (This level is intended to result in a test roughly comparable to an echo test with the same handset or headset installed in a complete telephone. It also results in an improved signal to noise ratio for the measurement.) 3318 9.6 Maximum acoustic output 3319 3320 3321 3322 3323 3324 3325 3326 3327 3328 3329 3330 3331 The testing methods provided in this clause only cover the application of in-band signals, but the same sound pressure limits may apply if ringing signals appear in the handset or headset receiver while the telephone set is offhook. See Annex N for a discussion of maximum pressure limits. 3332 9.6.1 3333 3334 3335 3336 3337 3338 3339 3340 3341 3342 3343 3344 3345 3346 The maximum acoustic pressure is the maximum steady state sound pressure emitted from a receiver. The stimulus for this test is a slow logarithmic sine sweep applied at RETP from 100 to 8500 Hz. The measurement shall be made with real-time filter analysis (RTA) in 1/12 octave bands, described in G.3. The detector shall be set to rms fast, which is a 250ms effective averaging time (equivalent to a 125ms time constant). The detector shall be set to hold the maximum level achieved in each band during the entire sweep. 3347 9.6.2 3348 3349 3350 3351 3352 3353 3354 3355 3356 The peak acoustic pressure is the maximum unweighted peak sound pressure emitted from a receiver. The stimulus for this test is a surge applied to the receive terminals of the handset or headset. The measurement shall be made at t h ee a rs i mu l a t orwi t ha nunwe i g ht e d“ pe a kh ol d”l e v e lde t e c t or ,wi t har i s et i mee qu a lt oorl e s st h a n50µs . 3357 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 79 maximum acoustic output measurements shall be made on the same ear simulator and with the same positioning and force as used for receive frequency response measurements. For handsets measured on HATS, an additional measurement with a force of 13N is required. See 5.1, as well as 5.3.2 for handsets, and 5.3.3 for headsets. Handset and headsets with adjustable receive volume controls shall be adjusted to the maximum setting. Acoustic output can be referenced to the ERP, DRP, free field (0 degrees elevation and azimuth), or to a diffuse field, as required by the appropriate safety standard. This may require measurements made at one reference point be translated to the required reference point. A filter may be required. See Annex C. Maximum acoustic pressure (long duration) The test shall be performed under the two following conditions: a) 10 dBV with a source impedance less than 10 b) 15 dBV with a source impedance of 150 The sweep time shall be at least 90 seconds. A sweep time should be selected that provides consistent results with no underestimation. That is, the result should be within 0.5 dB at all frequencies for a test period ± 30 seconds. Peak acoustic pressure (short duration) Connect the positive terminal of the surge generator (Error! Reference source not found.) to the positive terminal of the receive circuitry. Measure the peak pressure in the ear simulator while operating the surge generator. An os c i l l os c opeoras ou n dl e v e lme t e r ,h a v i n ga nunwe i g h t e d“ pe a kh ol d”s e t t i ngi sus e dt oma k et h eme a s u r e me n t . Reverse the connection and repeat. IEEE P269/D25 October 2004 3357 Annex A 3358 3359 (normative) 3360 3361 Ear Simulators with Flexible Pinnas and Positioning Devices 3362 Note to committee: Update with respect to new positioning methods. 3363 A.1 General characteristics of the ear simulators 3364 3365 3366 3367 3368 3369 3370 3371 3372 3373 3374 3375 3376 Type 3.3 and Type 3.4 ear simulators have a soft pinna which deforms when the receiver is pressed against it. The resulting leak depends on force or position, as well as the exact shape of the receiver. The relationship between position and force will vary depending on the shape of the receiver. 3377 A.2 Differences between the two ear simulators 3378 3379 3380 3381 3382 3383 3384 3385 3386 3387 3388 3389 3390 3391 3392 3393 3394 3395 3396 3397 3398 3399 3400 3401 The Type 3.3 ear simulator is shaped like a real human ear, while Type 3.4 ear simulator has a simplified shape. The change in force or position of the receiver against the ear simulator will cause the acoustic leak to vary. The leak will generally introduce variations in the frequency response, especially at the lower frequency range of the receiver, just as it does on a human ear. The variation of leak with force or position is often not linear, especially at very low forces (2N or less) or very high forces (13N or more). Both ears have acoustical characteristics similar to the average human adult ear. The measured results obtained by the Type 3.3 and Type 3.4 ear simulators may differ: a) The receiver position, or force applied, may result in leaks that are slightly different. In order to achieve a similar leak on the two different ear simulators with a handset, different forces may have to be applied. b) The acoustical input impedance of the two simulators is not identical. In general, the impedance of the Type 3.3 ear simulator is slightly higher than that of the Type 3.4 ear simulator. For measurements with similar leakage, the effect is that the receive loudness rating calculated from measurement on a Type 3.3 ear simulator could be one to two dB lower (louder) than that obtained from the Type 3.4 ear simulator. Regardless of these differences, both the Type 3.3 and Type 3.4 ear simulators are generally the most realistic way to measure handsets and headsets in a way that relates to the actual experience of real listeners. The choice between the Type 3.3 and Type 3.4 ear simulator is up to the user, as long as the restrictions in clause 5.1.1 are complied with. However, measurements using the two simulators cannot be expected to be exactly equal. The recommendations in this standard for using the Type 3.3 and Type 3.4 ear simulators reflect the currently available equipment. When new or revised simulators become available, their use should be carefully considered in view of the principles expressed in this standard as well as the information and recommendations provided by the equipment manufacturer. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 80 IEEE P269/D25 October 2004 3402 A.3 Handset Positioning devices 3403 3404 3405 3406 3407 3408 3409 3410 3411 3412 3413 3414 3415 3416 3417 3418 3419 3420 3421 3422 3423 3424 3425 3426 3427 3428 3429 3430 3431 3432 3433 3434 3435 3436 3437 3438 3439 In principle, positioning of a handset on the Type 3.3 or Type 3.4 ear simulator can be specified either by position relative to the ERP or by the applied force. The two are related, since greater applied force results in moving the receiver inward toward the center of the head. However, the relationship between applied force and position may be nonlinear. PThe positioning devices currently available for the Type 3.3 ear simulator can hold the receiver by position relative to the ERP or by force on the pinna. Positioning relative to ERP is typically very repeatable. The recommended procedure is to begin by placing the receiver in the positioning device without contacting the pinna, then gradually moving the receiver inward so as to increase the force, stopping at the target force or position. When using the positioning device currently available for the Type 3.3 ear simulator, placement by force is typically somewhat less repeatable than placement by position relative to the ERP. In addition, there can be a large difference in pinna deformation at a given force reading depending on whether the force has been increased from a low value to arrive at the target, or decreased from a high value. In other words, whether the receiver has been positioned from outside the ERP and moved in toward the center of the head, or the reverse. The recommended procedure is to begin by placing the receiver in the positioning device without contacting the pinna, and to gradually move the receiver inward so as to increase the force, stopping at the target force. 6 newtons is the default target force. The positioning device currently available for the Type 3.4 ear simulator can hold the receiver by force on the pinna. The positioning by force is typically very repeatable. There can be a difference in pinna deformation at a given force reading depending on whether the force has been increased from a low value to arrive at the target, or decreased from a high value. In other words, whether the receiver has been positioned from outside the ERP and moved in toward the center of the head, or the reverse. The recommended procedure is to begin by placing the receiver in the positioning device without contacting the pinna, and to gradually move the receiver inward so as to increase the force, stopping at the target force. 6 newtons is the default target force. When using the positioning device currently available for the Type 3.4 ear simulator, it is not possible to hold the receiver by position relative to the ERP. The positioning recommendations in this standard for positioning handsets or headsets on the Type 3.3 or Type 3.4 ear simulators reflect the currently available equipment. When new or revised positioning devices become available, their use should be carefully considered in view of the principles expressed in this standard as well as the information and recommendations provided by the equipment manufacturer. 3440 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 81 IEEE P269/D25 October 2004 3440 Annex B 3441 3442 (normative) 3443 3444 Alternative Ear Simulators, Mouth Simulator and Test Fixture 3445 3446 Note to committee: Update with respect to new positioning methods. 3447 B.1 Alternative Ear Simulators 3448 3449 3450 3451 3452 3453 3454 3455 3456 3457 3458 3459 3460 3461 3462 3463 3464 3465 3466 3467 3468 3469 The following specialized ear simulators may be used as alternates if the applicable performance specification requires or allows it, and if the following application requirements are met: a) The Type 1 ear simulator may be used for large, supra-aural or supra-concha, hard-cap, conically symmetrical receivers, which naturally seal to the simulator rim, in the band of 100-4,000 Hz. (The frequency range may be extended to 8500 Hz, but only if the performance specification requires it. However, the accuracy or relevance of the results in this extended range are not assured.) These receivers should also be tested in a realistic unsealed condition using the Type 3.3 or Type 3.4 ear simulator as specified in this sub-clause. b) The Type 2 ear simulator may be used for sealing or non-sealing receivers that are inserted into the ear canal. c) The Type 3.1 ear simulator may be used for intra-concha receivers designed for sitting on the bottom of the concha cavity. d) The Type 3.2 ear simulator with a high- or low-grade leak may be used for large, supra-aural or supraconcha, hard-cap, receivers, which naturally seal to the simulator rim, in the band of 100-8,000 Hz. The low leak is intended for receivers that are pressed firmly to the ear, while the high leak is intended for loosely coupled receivers. Ear simulator type numbers are defined in ITU-T Recommendation P.57. 3470 3471 3472 3473 3474 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 82 IEEE P269/D25 October 2004 3474 3475 3476 3477 3478 3479 Ear simulator recommendations are summarized in Table B. 1 Table B. 1 Table B. 1: Ear Simulator Type (ITU-T Recommendation P.57) Receiver Type Type 1 Supra-aural, hard cap Supra-concha, hard cap Type 2 Insert, sealed & unsealed Type 3.1 Intra-concha Concha bottom simulator Type 3.2 Simplified pinna simulator, Low- or High- grade leak Type 3.3 Anatomically-shaped soft pinna (Recommended choice) Type 3.4 Simplified soft pinna Supra-aural, hard cap Supra-concha, hard cap Intra-concha Supra-aural Supra-concha Circum-aural Intra-concha Supra-aural Supra-concha Circum-aural Application Notes 5-10 N force (handset only) Must naturally seal to rim No sealing putty allowed 100-4000 Hz bandwidth 100-8,500 Hz* bandwidth Headsets only 5-10 N force Must naturally seal to rim No sealing putty allowed 100-8,500 Hz* bandwidth 6 N force (handset only) 100-8,500 Hz* bandwidth 6 N force (handset only) 100-8,500 Hz* bandwidth (Recommended choice) 3480 3481 3482 3483 3484 3485 3486 3487 3488 3489 3490 3491 3492 3493 3494 *8,500 Hz. is the nominal upper frequency. See clause G.6 for details. Table B. 1 Ear simulator usage The Type 1 ear simulator measures at the ear reference point (ERP), while all the other ear simulators measure at the eardrum reference point (DRP). Measurements collected at the DRP shall be translated to the ERP. This is done because receive and sidetone specifications are referenced to the ERP. It also permits comparison of measurements made on the various type ear simulators. For Types 2, 3.1, 3.3 and 3.4 ear simulators, DRP to ERP translation shall be performed according to Annex C. For measurements of receive or talker sidetone using the Type 1 ear simulator, a leakage correction is often applied to the loudness rating calculation. Follow the applicable performance standard for the correction and how to apply it. The leakage correction is not applied to the frequency response. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 83 IEEE P269/D25 October 2004 3495 B.2 Alternative Mouth Simulator 3496 B.2.1 3497 3498 3499 3500 3501 3502 3503 3504 3505 3506 3507 3508 3509 3510 3511 3512 3513 3514 3515 When an alternative ear simulator described in clause B.1 is used, an alternative mouth simulator may be used. When measurements are being made exclusively in the send direction, an alternative mouth simulator may also be used. The mouth simulator recommended in Clause 5.2 is usually installed in a HATS, but the alternative ear simulators generally cannot be mounted to a HATS. Alternative mouth simulators and ear simulators are generally installed on a test head. The alternative mouth shall comply with the specification given in ITU-T Recommendation P.51, whereas the mouth recommended in Clause 5.2 must comply with ITU-T Recommendation P.58. There are minor differences between these specifications, so there may be small differences between the simulators. 3516 B.2.2 3517 3518 3519 3520 3521 3522 3523 3524 3525 3526 3527 3528 3529 3530 In principle, a 6.25 mm free-field microphone should be used to calibrate the mouth simulator. General The alternative mouth is suitable for measurements at or in front of the lip plane only. Traditionally, it has been used for measuring corded telephone handsets. Neither ITU-T Recommendation P.51 nor ITU-T Recommendation P.58 defines a sound field behind the lip plane. However, practical experience has shown that the sound field distribution in the region between the HATS mouth and ear closely approximates the sound field around a real human head up to at least 4 kHz. The region extends from beyond the lip plane to the base of the rubber ear and equal to or greater than 5 mm above the surface of the HATS cheek. This makes HATS suitable for testing headsets, cordless and cellular phones, handsfree phones, and traditional corded handsets. The sound field approximation may extend in frequency range as well as to other regions around HATS, but these have not yet been verified. Calibration of Alternative Mouth Simulator In practice, the mouth simulator may be calibrated at the MRP using a 12.5 mm free-field microphone oriented at 0 degrees to the mouth axis with the center of the protection grid at the MRP (Figure B. 1Figure B. 1Figure B. 1). The calibrated frequency response of the microphone should be taken into account. Subtract 0.6 dB from the measurement to give the actual sound pressure at the MRP. This compensates for the acoustic center of the microphone being slightly in front of the protection grid. The method is valid over the entire frequency range covered in this standard. An alternate method is to calibrate at the MRP using a 12.5 mm pressure microphone oriented at 90 degrees to the mouth axis with the center of the protection grid at the MRP. The calibrated frequency response of the microphone should be taken into account. This method is valid only to 5 kHz. 25 mm Free Field Microphone MRP 3531 3532 3533 3534 Lip Ring of Mouth Simulator Figure B. 1 On-Axis Calibration of mouth simulator Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 84 IEEE P269/D25 October 2004 3535 3536 3537 3538 3539 To calibrate the mouth, measure GMRP(f), the spectrum at the MRP. Adjust the mouth equalization to meet the target spectrum for the signal being used at a total sound pressure of -4.7 dBPa. This spectrum is used to calculate the send, sidetone and overall frequency responses. 3540 B.3 Alternative Test Fixture 3541 3542 3543 3544 3545 3546 3547 3548 3549 The test fixture shall implement the HATS position defined in ITU-T Recommendation P.64, Annex E. The HATS position may be implemented on a standard test head. The LRGP position was specified in previous editions of this standard. Send frequency response measurements made on ordinary telephones from 300-3400 Hz are expected to give practically identical results, whether obtained with LRGP or the HATS position. Systematic differences of about 1-2 dB in send frequency response measurements on pressure gradient microphones have to be expected from the upwards tilted speaking direction of about 19 degrees using the LRGP position. See ITU-T Recommendation P.64 (1999), Annex F. 3550 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 85 IEEE P269/D25 October 2004 3550 Annex C 3551 3552 (normative) 3553 3554 3555 3556 3557 3558 3559 3560 3561 3562 3563 3564 3565 3566 3567 3568 3569 3570 3571 3572 3573 3574 3575 3576 3577 3578 3579 3580 3581 3582 3583 3584 3585 3586 3587 3588 3589 DRP TO ERP and Related Translations All ear simulators except Type 1 are made with the measurement microphone in a position corresponding to the eardrum, so measurements are made at the drum reference point (DRP). For telephony measurements, the ear reference point (ERP) is used for loudness rating calculations and to maintain comparability to historical measurements. The measurements collected at the DRP are therefore generally translated to the ERP, or to another suitable acoustical terminal, depending on the application. For all measurements, the translation may be implemented by using a minimum-phase filter based on one of the tables or other transfer functions referred to in this annex. The magnitude of the filter response shall match the transfer function within a tolerance of 2 dB. A tolerance of 1 dB is preferred. A filter shall be used for measurements of peak acoustic pressure. (Peak measurements should be made on the actual waveform at the desired acoustic terminal. Both the magnitude and phase of the transfer function is necessary to best preserve the waveshape for a proper measurement of its peak value.) For measurements made with any kind of spectrum analysis, the translation may be performed with post-processing using one of the tables or other transfer functions referred to in this annex Measurement examples include frequency response, noise, linearity and distortion. These tables may also be used for frequency response measurements made with sine waves, if only the fundamental or total response is included. A filter is recommended for measurements of distortion. However, for measurements of distortion using a sine or narrowband stimulus, translation tables for post-processing may be constructed based on one of the tables or other transfer functions referred to in this annex. Separate tables are required for each harmonic or difference-frequency distortion product, taking into account the frequency offset between the stimulus frequency and the frequency of the distortion product. The translations given or referred to in this annex may be interpolated to match the frequency format of the measurement to which they are applied. The DRP to ERP translation, SDE, must be added to the data measured at the DRP in order to translate to the ERP. The effect is to remove a broad frequency response peak of about 10 dB in the region of 3000 Hz. The DRP to ERP translation in this annex is from ITU-T Recommendation P.57 (1996) as shown in table C.1. For this standard, the DRP to ERP correction curve is modified to extend to 25Hz. For table C.1, the correction below 92 Hz is zero. Table C.2 is derived from table C.1, in ISO R40 format and the correction below 100 Hz for table C.2 is zero. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 86 IEEE P269/D25 October 2004 DRP to ERP Translation (SDE ) 5 Amplitude (dB) 0 -5 -10 -15 -20 -25 100 1000 Frequency (Hz) 3590 3591 3592 3593 3594 3595 Figure C. 1 SDE at 1/12 Octave Filter Center Frequencies Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 87 10000 IEEE P269/D25 October 2004 3595 Frequency (Hz) 92 97 103 109 115 122 130 137 145 154 163 173 183 193 205 218 230 244 259 274 3596 3597 3598 3599 3600 SDE (dB) 0.1 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 -0.1 -0.1 0.0 0.1 0.0 -0.1 -0.2 -0.3 -0.3 Frequency (Hz) 290 307 325 345 365 387 410 434 460 487 516 546 579 613 649 688 729 772 818 866 SDE (dB) -0.3 -0.2 -0.2 -0.2 -0.4 -0.5 -0.4 -0.6 -0.3 -0.7 -0.6 -0.6 -0.6 -0.6 -0.8 -0.8 -1.0 -1.1 -1.1 -1.2 Frequency (Hz) 917 972 1029 1090 1155 1223 1296 1372 1454 1540 1631 1728 1830 1939 2054 2175 2304 2441 2585 2738 SDE (dB) -1.3 -1.4 -1.8 -2.0 -2.3 -2.4 -2.6 -3.1 -3.3 -3.9 -4.4 -4.8 -5.3 -6.0 -6.9 -7.5 -8.1 -9.1 -9.5 -10.4 Frequency (Hz) 2901 3073 3255 3447 3652 3868 4097 4340 4597 4870 5158 5464 5788 6131 6494 6879 7286 7718 8175 8659 Table C. 1 SDE at 1/12 Octave Filter Center Frequencies Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 88 SDE (dB) -11.0 -10.5 -10.2 -9.1 -8.0 -6.9 -5.8 -5.0 -4.2 -3.3 -2.7 -2.4 -2.4 -2.5 -3.3 -4.5 -5.9 -9.0 -14.2 -20.7 IEEE P269/D25 October 2004 3600 3601 3602 3603 3604 3605 3606 3607 3608 3609 3610 Frequency (Hz) 100 106 112 118 125 132 140 150 160 170 180 190 200 212 224 236 250 265 280 SDE (dB) 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 -0.1 -0.1 0.0 0.1 0.0 -0.1 -0.1 -0.2 -0.3 -0.3 Frequency (Hz) 335 355 375 400 425 450 475 500 530 560 600 630 670 710 750 800 850 900 950 SDE (dB) -0.2 -0.3 -0.4 -0.4 -0.5 -0.4 -0.5 -0.7 -0.6 -0.6 -0.6 -0.7 -0.8 -0.9 -1.1 -1.1 -1.2 -1.3 -1.4 Frequency (Hz) 1120 1180 1250 1320 1400 1500 1600 1700 1800 1900 2000 2120 2240 2360 2500 2650 2800 3000 3150 SDE (dB) -2.1 -2.3 -2.5 -2.8 -3.2 -3.6 -4.2 -4.7 -5.2 -5.8 -6.5 -7.2 -7.8 -8.5 -9.3 -9.9 -10.6 -10.7 -10.4 300 -0.2 1000 -1.6 3350 -9.6 315 -0.2 1060 -1.9 3550 -8.5 Frequency (Hz) 3750 4000 4250 4500 4750 5000 5300 5600 6000 6300 6700 7100 7500 8000 8500 9000 9500 10000 SDE (dB) -7.5 -6.3 -5.3 -4.5 -3.7 -3.0 -2.6 -2.4 -2.5 -2.9 -4.0 -5.3 -7.5 -12.2 -18.6 * * * Table C. 2 SDE at ISO R40 Preferred Frequencies Translation from DRP to free field at 0 degrees azimuth and 0 degrees elevation, or diffuse field, or any other similar acoustical terminal shall be made using the transfer function supplied by the manufacturer of the ear simulator, if available. Alternatively, the transfer functions specified in ITU-T Recommendation P.58 may be used. Transfer functions with resolution of at least 1/12 octave or R40 format shall be used if available. Report the transfer function used. 3611 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 89 IEEE P269/D25 October 2004 3611 Annex D 3612 3613 (normative) 3614 3615 3616 3617 3618 3619 3620 3621 3622 3623 3624 3625 3626 3627 3628 3629 3630 3631 3632 3633 3634 3635 3636 3637 3638 3639 3640 3641 3642 3643 Conditioning for Carbon Transmitters The orientation of a carbon transmitter during test, and the treatment it receives immediately prior to a test, can have a significant influence on test results. Conditioning should be applied before making any measurement, and the measurement should start within 10 s after conditioning. Because of the wide possible variation in handset geometries and test fixtures, general guidelines are given for conditioning, rather than detailed specifications. For tests between different locations, it is recommended that identical procedures, as nearly as possible, be used to reduce differences and to make results comparable. For best reproducibility, automatic mechanical conditioning should be used. Connect the telephone set terminals as required to the feed circuit and the appropriate terminating load. Turn the feed current on. After 5 s, condition the microphone by rotating it smoothly. Rotation is made so that the plane of the granule bed moves through an arc of at least 180° and back. The rotation procedure is repeated twice with the handset coming to rest in the test position without jarring the carbon granules. The time of each rotation cycle should lie within the range of 2–12 s. The final handset position should be 45 degrees face-up for all transmission testing, i.e. send, receive, sidetone, overall. NOTE: The axis of rotation for conditioning may be arbitrarily located with respect to the transmitter axis. In practice, one orientation that provides the proper motion for many existing telephone sets is to have the axis of rotation coaxial with the axis of the mouth simulator. The performances of existing types of handset receivers are independent of the position (vertical, horizontal face-up, or down) of the handset, but carbon transmitter resistance may affect receiving output. In this case, the conditioning procedure in this annex should be followed. 3644 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 90 IEEE P269/D25 October 2004 3644 Annex E 3645 3646 (normative) 3647 3648 3649 3650 3651 3652 3653 3654 3655 3656 3657 3658 3659 3660 3661 3662 3663 3664 3665 3666 Hoth Room Noise Hoth noise can be described as acoustic random noise that has a power density spectrum corresponding to that specified in Table E. 1Table E. 1Table E. 1. The spectrum of Hoth noise is designed to simulate typical ambient room noise over time. Table E. 1Table E. 1Table E. 1 below gives the spectrum density adjusted in level to produce a reading of 50 dBA. Figure E. 1Figure E. 1Figure E. 1 shows a plot of this spectrum. The spectrum below is independent of level and shifts equally for each 1/3 octave band. Frequency (Hz) Spectrum Density Bandwidth (dB SPL/Hz) _ƒ( d B) 100 125 160 200 250 315 400 500 630 800 1000 1250 1600 2000 2500 3150 4000 5000 6300 8000 32.4 30.9 29.1 27.6 26.0 24.4 22.7 21.1 19.5 17.8 16.2 14.6 12.9 11.3 9.6 7.8 5.4 2.6 -1.3 -6.6 13.5 14.7 15.7 16.5 17.6 18.7 19.7 20.6 21.7 22.7 23.5 24.7 25.7 26.5 27.6 28.7 29.7 30.6 31.7 32.7 10 log Total power in each 1/3 Octave Band (dBSPL) 45.9 45.5 44.9 44.1 43.6 43.1 42.3 41.7 41.2 40.4 39.7 39.3 38.7 37.8 37.2 36.5 34.8 33.2 30.4 26.0 Tolerance (dB) ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 ±3 Table E. 1 Hoth noise parameters Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 91 IEEE P269/D25 October 2004 Spectrum Density (dBSPL/Hz) Hoth Noise Spectrum Density Vs Frequency 35 30 25 20 15 10 5 0 -5 -10 100 3667 3668 3669 3670 3671 3672 3673 3674 3675 3676 3677 3678 3679 3680 3681 3682 1000 Frequency (Hz) 10000 Figure E. 1 Hoth noise spectrum Typical Hoth noise levels range from 35 dBA to 65 dBA. At low frequencies, sound levels are somewhat difficult to control due to both the size of the test chamber, and the introduction of external noise (air-conditioning/heating etc.). The test chamber should be designed to minimize undesirable low frequency sound levels. For optimum ambient noise simulation in the test chamber, it is best to have a diffuse source for Hoth noise. This can best be achieved by having somewhat reflective walls, and multiple sound sources. A compromise can be made with either the room, or the number of sound sources. 3683 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 92 IEEE P269/D25 October 2004 3683 Annex F 3684 3685 (normative) 3686 3687 Test Signals 3688 3689 F.1 General 3690 3691 3692 3693 3694 3695 3696 3697 3698 3699 3700 3701 3702 3703 3704 3705 3706 3707 3708 3709 3710 3711 3712 3713 3714 3715 The test signal should place the telephone in a well-defined, reproducible state for the period of the measurement. It should insure that the transfer function of the unit remains stable during the measurement period, and yet provide a suitable signal for the specific measurement. The choice of the signal will be a balance between one that correctly stimulates the processing algorithms in the telephone, and one that is suitable for the specific measurement. 3716 F.2 Classifications 3717 3718 3719 3720 3721 3722 3723 3724 3725 The various types of signals are divided into several groups, as discussed below. The classical measurement signals can be separated into deterministic signals and continuous random signals. More complex random signals include modulated random signals and speech-like signals that characterize human speech. Finally, there are compound signals composed of two sources: one for biasing the unit into a stable state, and the other being the actual test signal itself. 3726 F.3 Modulation types 3727 3728 3729 Several types of modulation may be applied to deterministic or random signals. approximate the syllabic rhythm of real speech. Unless otherwise stated, test signal levels are specified as long-term rms levels during at least one complete period of the active part of the signal. The long-term rms level of artificial voices (F.6.1.1), speech-like signals with pauses less than 20ms, and signals with sinusoidal or pseudo-random modulation (F.3.2 & F.3.3 & F.6.1.3) shall be measured during at least one complete cycle of the modulation pattern. The level of signals with square-wave modulation (F.3.1) may be measured during the entire signal and then c or r e c t e dt oa c c ou n tf ort h edut yc y c l e .Fore x a mpl e ,a250ms“ on ”pe r i odf ol l owe dbya150ms“ of f ”pe r i odwou l d have a duty cycle of 5/8, which corresponds to –2.04 dB. A long-term rms measurement of such a signal, including the pauses, would underestimate the active level by 2.04 dB. The level of random signals (F.5) shall be measured for long enough (large enough time-bandwidth product) to insure that the measurement error (+/- one standard deviation) is 0.5 dB or less. The level of speech–like signals with pauses (F.6.1.2, F.6.2, F.6.3) shall be measured with a speech voltmeter or other algorithm which meets the specifications of ITU-T Recommendation P.56, Method B. The level of compound signals (F.7) shall be measured according to the principles of this clause. The details vary according to the exact signal. Clause F.7 offers some additional guidelines. In addition to the signals described in Annex F, signals described in ITU-T Recommendation P.501 are also recommended when they are appropriate. This is done in order to Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 93 IEEE P269/D25 October 2004 3730 3731 3732 3733 3734 3735 Test signals may be modulated in various ways to correctly stimulate a telephone, depending on the signal processing actually used in the phone. For example, a modulated noise signal is often an appropriate stimulus for a send circuit with a noise-guard feature. In the presence of a continuous signal over a few hundred milliseconds in duration, the noise-guard process reduces gain substantially. On the other hand, a continuous noise signal is often an appropriate stimulus for a receive circuit with automatic gain control (AGC). 3736 F.3.1 3737 3738 3739 3740 3741 3742 3743 3744 3745 3746 Square wave modulation is an on-off pattern. The recommended pattern is 250 ms ON and 150 ms OFF, 10ms. This pattern is common in many telephone testing methods. It is close to the modulation rate of real speech. Other timing patterns may also be used. 3747 F.3.2 3748 3749 3750 Sine wave modulation may be used to produce a simple and smooth speech amplitude envelope. The recommended rate is 4 Hz. Modulation depth should be at least 50%, but not so great as to introduce distortion. 3751 F.3.3 3752 3753 3754 3755 Pseudo-random modulation may be used to produce a relatively speech-like amplitude envelope. The modulation spectrum should cover from approximately 1 to 10 Hz, with the center at approximately 4 Hz. The extremes of the modulation spectrum should be rolled off gradually. 3756 F.4 Deterministic signals 3757 3758 3759 3760 Deterministic (periodic) signals can always be used to measure the frequency response of linear, time invariant telephones. When modulated, they can be used to measure the response of telephones with many, but not all, speech-processing features. 3761 F.4.1 3762 3763 3764 3765 3766 3767 In addition to use in measuring the frequency response of linear, time invariant telephones, sine waves are useful for measurements of harmonic and difference-frequency distortion. This signal can be modulated by square wave, sine wave, and pseudo-random signals. 3768 F.4.2 3769 3770 3771 3772 3773 3774 3775 A pseudo-random signal has a periodic structure in the time domain. In the frequency domain, almost any magnitude and phase spectrum is possible. When used with FFT types of analysis, the period of the pseudo-random signal is generally matched in length and synchronously triggered at the start of the analysis period. When used with an MLS analyzer, the period of the MLS signal must be matched to the analysis period. This signal can be modulated by square wave, sine wave and pseudo-r a n doms i g n a l s .I fs qu a r ewa v emodul a t i oni su s e d,t h e“ on ”t i me must correspond to one or more complete period(s) of the pseudo-random signal. Square wave modulation In some cases, a periodic pulse pattern of this type will not correctly activate the telephone circuit. In such cases, a r a n doml yv a r i e dpu l s epa t t e r nma ybeus e d.Th ea v e r a g e“ on ”a n d“ of f ”t i me ss h ou l da ppr ox i ma t e250msa n d150 ms respectively. With this type of modulation, all measurements are t obep e r f or me ddu r i ngt h e“ on ”pa r toft h epa t t e r n .Forot h e r types of modulation, the signal is to be measured during the entire presentation time. Sine wave modulation Pseudo-random modulation Sine wave The target spectrum for sine wave signals is flat, which means equal amplitude at all frequencies. Pseudo-random Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 94 IEEE P269/D25 October 2004 3776 The target spectrum for pseudo-random signals can be white (F.5.1), pink (F.5.2) or P.50 (F.5.3). 3777 F.5 Random signals 3778 3779 3780 3781 3782 3783 3784 3785 3786 Random signals can be described by their statistical characteristics, such as the long-term power spectral density and probability density functions. These signals are not periodic, but are stationary as far as these statistical characteristics are concerned. When measuring such signals, a sufficient number of averages should be taken to obtain a given accuracy in estimating the long-term spectrum. 3787 F.5.1 3788 3789 3790 3791 3792 3793 White noise has a constant spectral density per hertz. The amplitude distribution is typically truncated Gaussian, with a crest factor of 12 dB, 2 dB. This signal can be modulated by square wave, sine wave and pseudo-random signals. 3794 F.5.2 3795 3796 3797 3798 3799 3800 3801 Pink noise has a power spectral density that decreases 3 dB per octave. The amplitude distribution is typically truncated Gaussian, with a crest factor of 12 dB, 2 dB. This signal can be modulated by square wave, sine wave and pseudo-random signals. 3802 F.5.3 3803 3804 3805 3806 3807 3808 3809 The spectrum of this signal is the same as artificial voices (F.6.1.1). The amplitude distribution is typically truncated Gaussian, with a crest factor of 12 dB, 2 dB. This signal can be modulated by square wave, sine wave and pseudorandom signals. 3810 F.6 Speech-like signals 3811 3812 3813 3814 3815 3816 Speech-like signals include ITU-T Recommendation P.50 (1999) artificial voices, ITU-T Recommendation P.59 (1993) artificial conversational speech, simulated speech generator (SSG), as well as synthesized and real speech signals. When long term averaging is used, these signals place the telephone in a well-defined reproducible state, ensure that the transfer function of the unit remains stable, and provide a suitable signal for the specific measurement. 3817 F.6.1 3818 3819 3820 Typical parameters of simulated speech include long-term average spectrum, short-term spectrum, instantaneous amplitude distribution, speech waveform structure, and the syllabic envelope. In practice, many practical noise generators produce pseudo-random signals, typically with a very long period. If the period of such signals is very long compared to the analysis period, and if the analysis period is not correlated to the generator period, then these signals can be considered random. White noise The target spectrum for white noise is flat, when analyzed in fixed bandwidths. When analyzed in constant percentage bandwidths, this is equivalent to a spectrum with band levels rising at 3 dB per octave. Pink noise The target spectrum for pink noise is flat, when analyzed in constant percentage bandwidths. When analyzed in fixed bandwidths, this is equivalent to a spectrum with band levels falling at 3 dB per octave. P.50 noise Th et a r g e ts pe c t r um f orP. 5 0n oi s ei st h ec ol umn“ Soun dpr e s s u r el e v e l( t h i r doc t a v e ) ”i nTa bl e1ofI TU-T Recommendation P.50. The table can be used directly for the acoustic test spectrum at an overall level of–4.7 dBPa. A constant can be added in all frequency bands to give other overall levels. Simulated speech Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 95 IEEE P269/D25 October 2004 3821 3822 3823 3824 The target spectrum for s i mu l a t e ds pe e c hi st h ec ol umn“ Sou n dpr e s s u r el e v e l( t h i r doc t a v e ) ”i nTa bl e1ofI TU-T Recommendation P.50. The table can be used directly for the acoustic test spectrum at an overall level of–4.7 dBPa. A constant can be added in all frequency bands to give other overall levels. 3825 F.6.1.1 3826 3827 3828 3829 3830 3831 3832 3833 3834 3835 3836 3837 3838 P.50 Artificial Voices ITU-T Recommendation P.50 defines the temporal and spectral parameters for test signals which emulate the characteristics of male and female speech. These artificial voices are continuous speech signals with a frequency range of 89.1 Hz to 8919 Hz. See Clause F.10,“ Test signals published on CD-ROM, ”f oron es ou r c eoft h e s ea n d other test signals. Note: The P.50 signals published on the CD-ROM will have to be equalized to meet the target spectrum. At least one complete segment of both male and female artificial voices should be used as the standard test signal. The male and female artificial voices are each approximately 10.5 sec. long. The combined test signal should consist of the male followed by the female artificial voices, resulting in a signal length of approximately 21 sec. No gap in the combined test signal should exceed 100 ms. 3839 F.6.1.2 P.59 Artificial Conversational Speech. 3840 3841 3842 3843 3844 Artificial conversational speech is a test signal generated by inserting pauses in the continuous artificial voices described by ITU-T Recommendation P.50 (1999). The on-off temporal characteristics of conversational speech are defined in ITU-T Recommendation P.59 (1993). This test signal is useful for evaluating devices that are sensitive to the on-off nature of conversational speech, in both single and double-talk modes. 3845 F.6.1.3 3846 3847 3848 3849 3850 3851 3852 To generate a signal approximating the amplitude distribution of speech, a main signal having a Gaussian distribution is modulated by a specially tailored modulating signal, and the resultant signal is shaped to approximate the long-term frequency spectrum of speech. See Annex Q for details of this signal. See Clause F.10,“ Test signals published on CD-ROM, ”f oron es ou r c eoft h i sa n dot h e rt e s ts i gn a l s . 3853 F.6.2 3854 3855 3856 3857 3858 3859 3860 Speech-like signals may be produced using a digital processing technique rather than applying one of the signal sources described above. Conversational speech can be sampled, digitized, processed, and reproduced as synthesized speech. It also may be created from complex multiple tones that simulate the talk-spurts, pauses, and activity factors associated with speech characteristics. 3861 F.6.3 3862 3863 3864 3865 3866 3867 3868 Speech-like signals are not limited to signal sources or synthesized digital processing, but also may include real speech signals. This is often done by recording conversational speech, preferably in a digital format, to avoid signal degradation with use. These real speech recordings are then reproduced using a playback device as the signal source. See Clause F.10,“ Test signals published on CD-ROM, ”f oron es ou r c eoft h e s ea ndot h er test signals. Simulated Speech Generator (SSG). Note: The SSG signal published on the CD-ROM will have to be equalized to meet the target spectrum. Synthesized speech The target spectrum for synthesized speech is the original spectrum produced by the synthesis procedure. Real speech The target spectrum for real speech is the original spectrum of the recorded speech. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 96 IEEE P269/D25 October 2004 3869 F.7 Compound signals 3870 3871 3872 3873 3874 3875 3876 3877 3878 3879 3880 3881 3882 3883 3884 3885 The signals described above rely on one signal source to place the telephone in a well-defined reproducible state, insure that the transfer function of the unit remains stable, and provide a suitable signal for the specific me a s u r e me n t .Bya ppl y i ngt wos i gn a ls ou r c e s ,on ec a nbeu s e ds pe c i f i c a l l yf or“ bi a s i n g ”t h eu n i ti nt oas t a bl e , reproducible state, while the other is the actual test signal required for measurements. These compound signals include those where the two sources are applied in sequence, and those where both sources are applied simultaneously. Compound test signals can provide extra test flexibility and solve problems which are difficult or impossible using simple test signals. The bias signal can be a signal that, by itself, is unsuitable or very inconvenient for the actual measurement. The measurement signal can be a signal that, by itself, is unsuitable as a bias signal. If desired, the measurement signal can be presented so as not to have a substantial effect on the action of the bias signal. This can be done by adjusting the temporal and/or level relationships between the two signals. The bias signal can be changed to put the telephone in different states with minor or even no change in the measurement signal. 3886 F.7.1 Sequential presentation 3887 3888 3889 3890 3891 3892 3893 3894 3895 3896 3897 3898 3899 3900 3901 3902 3903 3904 This class of test signals is characterized by the separation of the bias and analysis signals in time. The bias signal is presented until the telephone is in a stable state. Once a stable state is reached, the appropriate analysis signal is applied and a measurement is performed. The analysis should be completed while the telephone is still in its stable state. The CSS is one example of this type of signal. 3905 F.7.2 3906 3907 3908 3909 3910 3911 3912 3913 3914 3915 This class of test signals is characterized by presentation of the bias and analysis signals at the same time. Some conditioning of the telephone may be required before beginning the analysis. The bias and analysis signals must be separable by the analysis method. A synchronous analysis method is usually required. The P.50 Burst with Sine Sweep is one example of this type of signal. 3916 F.7.2.1 3917 3918 3919 This compound signal has two components, which are presented at the same time, but not synchronized with each other. The bias signal is P.50 noise presented in bursts (see F.5.3 and F.3.1) The bias is intended to ensure that the telephone is in a stable, well-defined operating state. The measurement signal (TDS sweep) is intended to ensure a The Composite Source Signal (CSS) is a compound signal using a voiced signal to simulate the voice properties, followed by a noise-like signal for measuring the transfer functions, and an inserted pause to provide amplitude modulation. The noise-like signal has either a flat or speech shaped power density spectrum. It has the advantage of short measurement periods and duplex operation where, using an uncorrelated double-talk signal, the test signals can be applied from the talking and listening directions at the same time. See ITU-T Recommendation P.501 (1996) for the definition of this signal. See Clause F.10,“ Test signals published on CD-ROM, ”f oron es ou r c eoft h i sa n dother test signals. I ft h es i gn a li n c l u de spa u s e s ,c a l i br a t i ona n dme a s u r e me nt sa r et obepe r f or me ddu r i n gt h e“ on ”pa r toft h epa t t e r n . The target spectrum of the voiced part of this signal is defined in ITU-T Recommendation P.501. The noise part may have various target spectra, according to the application. The target spectrum may be white noise (F.5.1), pink noise (F.5.2) or P.50 noise (F.5.3). Simultaneous presentation The target spectrum of the total signal (bias plus analysis) is the same as the target spectrum of the bias signal. The analysis part of the signal (for example, the TDS sweep) may have to be shaped to fulfill this requirement, but there is no other requirement on the spectrum of the analysis part of the signal. TDS Sweep with P.50 Noise Bursts. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 97 IEEE P269/D25 October 2004 3920 3921 3922 3923 3924 3925 3926 well-defined, reproducible measurement, which is especially well adapted to simulated free-field techniques. An anechoic room is not necessary when using this signal. See Annex R for a detailed description of this signal. 3927 F.7.2.2 3928 3929 3930 3931 3932 3933 3934 Similar to F.7.2.1, except the bias is the continuous artificial voices signal defined in ITU-T Recommendation P.50 (1999). (See F.6.1.1). 3935 F.7.2.3 3936 3937 3938 3939 Similar to F.7.2.1, except the bias is real speech (F.6.3). 3940 F.7.2.4 3941 3942 3943 3944 Similar to F.7.2.1, except the bias is synthesized speech (F.6.2). 3945 F.7.2.5 3946 3947 3948 3949 3950 Similar to F.7.2.1, except the bias is white or pink random noise (F.5). Pseudorandom noise (F.4.2) with white or pink spectrum is considered equivalent if the pseudorandom period is not correlated with the bias. 3951 F.7.2.6 3952 3953 3954 3955 3956 3957 3958 3959 3960 3961 3962 This compound signal has two components, which are presented at the same time, but not synchronized with each other. The bias signal is P.50 noise presented in bursts (see F.5.3 and F.3.1) The bias is intended to insure that the telephone is in a stable, well-defined operating state. The measurement signal (pseudorandom noise) is intended to ensure a well-defined, reproducible measurement, which is especially well adapted to simulated free-field techniques. An anechoic room is not necessary when using this signal. 3963 F.7.2.7 3964 3965 3966 Similar to F.7.2.6, except the bias is the continuous artificial voices signal defined in ITU-T Recommendation P.50 (1999). (See F.6.1.1). Th et a r g e ts pe c t r umi st h ec ol umn“ Sou n dpr e s s u r el e v e l( t hi r doc t a v e ) ”i nTa bl e1ofI TU-T Recommendation P.50. The table can be used directly for the acoustic test spectrum at an overall level of–4.7 dBPa. A constant can be added in all frequency bands to give other overall levels. TDS Sweep with P.50 Artificial Voices. Th et a r g e ts pe c t r umi st h ec ol umn“ Sou n dpr e s s u r el e v e l( t hi r doc t a v e ) ”i nTa bl e1ofI TU-T Recommendation P.50. The table can be used directly for the acoustic test spectrum at an overall level of–4.7 dBPa. A constant can be added in all frequency bands to give other overall levels. TDS Sweep with Real Speech The target spectrum is the original spectrum of the recorded speech. TDS Sweep with Synthesized Speech The target spectrum is the original spectrum produced by the synthesis procedure. TDS Sweep with Random or Pseudorandom Noise The target spectrum is white or pink. Pseudorandom Noise with P.50 Noise Bursts. Th et a r g e ts pe c t r umi st h ec ol umn“ Sou n dpr e s s u r el e v e l( t hi r doc t a v e ) ”i nTa bl e1ofI TU-T Recommendation P.50. The table can be used directly for the acoustic test spectrum at an overall level of–4.7 dBPa. A constant can be added in all frequency bands to give other overall levels. Pseudorandom Noise with P.50 Artificial Voices. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 98 IEEE P269/D25 October 2004 3967 3968 3969 3970 Th et a r g e ts pe c t r umi st h ec ol umn“ Sou n dpr e s s u r el e v e l( t hi r doc t a v e ) ”i nTa bl e1ofI TU-T Recommendation P.50. The table can be used directly for the acoustic test spectrum at an overall level of–4.7 dBPa. A constant can be added in all frequency bands to give other overall levels. 3971 F.7.2.8 3972 3973 3974 3975 Similar to F.7.2.6, except the bias is real speech (F.6.3). 3976 F.7.2.9 3977 3978 3979 3980 Similar to F.7.2.6, except the bias is synthesized speech (F.6.2). 3981 F.7.2.10 Pseudorandom Noise with Random or Pseudorandom Noise 3982 3983 3984 3985 3986 Similar to F.7.2.6, except the bias is white or pink random noise (F.5). Pseudorandom noise (F.4.2) with white or pink spectrum is considered equivalent if the pseudorandom period is not correlated with the bias. 3987 F.7.2.11 Sine Wave with Notched Real Speech. 3988 3989 3990 3991 3992 A sine wave is the measurement signal and real speech is the bias signal. A notch filter removes a band of the speech signal at the sine wave frequency. 3993 F.8 Test signal bandwidth 3994 3995 3996 3997 3998 3999 4000 4001 In general, the test signals and analysis methods in this standard cover a frequency range from approximately 100 to 8500 Hz. The exact range depends on the analysis method, and perhaps also the test signal (see G.6). The lower limit is the practical lower limit of the mouth simulator, while the upper limit is determined by the range of the DRP-to-ERP translation curve (Annex C). For digital phones, the exact range may also be determined by the codec. Pseudorandom Noise with Real Speech The target spectrum is the original spectrum of the recorded speech. Pseudorandom Noise with Synthesized Speech The target spectrum is the original spectrum produced by the synthesis procedure. The target spectrum is white or pink. The target spectrum is the original spectrum of the recorded speech. Some signals, such as SSG (F.6.1.3), are defined only for a smaller bandwidth, and cannot be used outside their defined range. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 99 IEEE P269/D25 October 2004 4001 F.9 Signal parameter summary 4002 4003 4004 4005 4006 Table F. 1Table F. 1Table F. 1 defines the bandwidth and maximum analysis interval for the various test signals identified in Annex F. Signals may be analyzed with finer resolution if desired. These parameters shall be applied to both the calibration and test procedures. Document Test Signal Ref. Maximum Analysis Interval Alternative Analysis Format F.4.1 Sine Wave* Flat ISO R40 steps 1/12 Oct. steps F.4.2 Pseudo-Random* White, pink or P.50 25 Hz bands 1/12 Oct. bands F.5.1 White Noise* White 25 Hz bands 1/12 Oct. bands F.5.2 Pink Noise* Pink 1/12 Oct. bands 25 Hz bands F.6.1.1 P.50 Artificial Voices P.50 1/12 Oct. bands 25 Hz bands P.50 1/12 Oct. bands 25 Hz bands P.50 1/12 Oct. bands 25 Hz bands F.6.1.2 F.6.1.3 P.59 Artificial Conversational Speech Simulated Speech Generator F.6.2 Synthesized Speech As synthesized 1/12 Oct. bands 25 Hz bands F.6.3 Real Speech As recorded 1/12 Oct. bands 25 Hz bands F.7.1 Composite Source Signal See F.7.1 25 Hz bands 1/12 Oct. bands TDS Sweep with Bias Same as bias 50 Hz Bands 1/12 Oct. bands Pseudorandom noise with Bias Same as bias 50 Hz Bands 1/12 Oct. bands F.7.2.1F.7.2.5 F.7.2.6F.7.2.10 4007 4008 4009 4010 4011 4012 Target Spectrum * Modulation may be required depending on the application. See F.3. Table F. 1Test signal parameters 4013 F.10 Test signals published on CD-ROM 4014 4015 4016 4017 The artificial voices according to ITU-T Recommendation P.50 , as well as a large speech database, is included on a CD-ROM published as ITU-T Recommendation P.50, Appendix 1: Test signals. Other specialized signals, including the composite source signal (CSS) are published on a CD-ROM included with ITU-T Recommendation P.501 . Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 100 IEEE P269/D25 October 2004 4018 4019 F.11 Signal and test method comparative summary 4020 4021 4022 Table F. 2Table F. 2Table F. 2 identifies the various test signals described previously. The corresponding test methods and conditions are shown for each signal. The various method classifications are described in Annex G. Signal Type Pink Noise Simulated Speech Synthesized Speech Real Speech Sequential Simultaneous Random Signal White Noise Deterministic Signal Pseudorandom Test Method Anechoic Chamber Compound Needed? Speech-Like Signal Signal Sine Wave Sec. Ref. 5.2.1 5.2.2 5.2.3 FFT/Cross Spectrum Dual-Channel FFT Single-Channel FFT Max. Length Seq. Y Y N Y Y R Y Y N Y Y N Y Y N Y Y N Y Y N Y Y Y Y Y Y Y* Y Y* 5.3.1 5.3.2 Real-Time Filter Dual-Channel RTA Single-Channel RTA Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y Y N N Y Y R N N N N N N N Y Y 5.4.2 Swept Sine R N N N N N N 5.4.3 Time Delay Spectr. R N N N N N N Y Test method is appropriate for this signal. N Should not be used. R Required signal with this test method. * Anechoic chamber is required unless simulated free field methods are used. Y Y Y Y Y Y* Sine-Based 5.4.1 4023 4024 4025 Discrete Tone Table F. 2 Signal compatibility with test method 4026 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 101 IEEE P269/D25 October 2004 4026 Annex G 4027 4028 (normative) 4029 4030 Analysis Methods 4031 4032 4033 G.1 General 4034 4035 4036 4037 4038 4039 4040 4041 4042 4043 4044 4045 4046 4047 4048 4049 4050 4051 4052 4053 4054 4055 4056 4057 4058 Various analysis techniques are available for electroacoustic measurements. Each technique has inherent advantages and limitations. A particular method can be better suited for use with certain stimulus signals. Certain methods, in fact, rely upon the use of a synchronized or otherwise unique stimulus signal. This clause describes the most common techniques and their application to measurements of analog and digital telephones using handsets and headsets. The recommended method for calculating frequency response is based on dividing one rms spectrum by another. See Equation 7.1Equation 7.1Equation 7.1 as an example in the case of receive frequency response. This method is satisfactory and accurate in the great majority of cases. It applies to methods that measure an rms spectrum such as single-channel FFT(G.2.2) and real-time filter analysis (G.3). It also applies to stepped or swept sine methods (G.4.1 & G.4.2), if an rms detector insensitive to jitter is used. In some cases it may be useful or desirable to use an alternative measurement method which calculates frequency response by use of a cross-spectrum or similar process. These methods include dual-channel FFT (G.2.1), MLS (G.2.3), TDS (G.4.3) and stepped or swept sine methods (G.4.1 & G.4.2) in which a quadrature or similar detector is used. Such methods can sometimes reduce measurement time, reduce the influence of noise, or offer other benefits. Cross-spectrum and related methods are usually sensitive to jitter or other unstable phase or time relationships that can exist between input and output of a telephone with some kinds of digital processing. The test report must include sufficient justification for use of cross-spectrum methods, such as demonstrating that the delay and phase response are repeatable. If cross-spectrum or related methods are used, the receive frequency response in dB, HR(f), is given by Equation G. 1Equation G. 1Equation G. 1: H R ( f ) 20 log 4059 4060 4061 4062 4063 4064 4065 4066 4067 4068 4069 4070 4071 4072 4073 G( RETP )( ERP ) ( f ) G RETP ( f ) in dBPa / V Equation G. 1 where: G(RETP)(ERP) (f) is the cross spectrum between RETP and ERP. GRETP(f) is the rms spectrum at RETP Similar formulas apply to other measurement paths. Some systems may introduce significant delay such that the output is not time aligned with the stimulus signal. Care should be taken that this does not introduce errors. The measurement system shall compensate for this delay as long as the delay is stable. If the delay is not stable, cross-spectrum methods shall not be used, and the test signal shall be at least 10 times longer than the variation in delay. See Annex L for measurements in delay. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 102 IEEE P269/D25 October 2004 4074 G.2 Fast Fourier transform (FFT) and cross spectrum analysis 4075 4076 4077 4078 4079 4080 4081 4082 4083 4084 4085 4086 4087 4088 4089 4090 4091 The Fourier Transform is a mathematical operation that decomposes a time signal into its complex frequency components. The Inverse Fourier Transform reverses the process, reconstructing the time signal from its Fourier components. By applying the FFT algorithm to a sampled time signal, a spectrum can be computed. This is a parallel analysis resulting in a narrow band (constant bandwidth) frequency spectrum. Low frequency resolution can be limited. Here, blocks of time data are analyzed. 4092 G.2.1 4093 4094 4095 4096 4097 4098 4099 4100 A dual-channel FFT analyzer performs simultaneous measurements of the telephone input and output. This type of measurement is optimized for system analysis. Most FFT analyzers calculate the frequency response from the cross spectrum and either the input or output autospectrum. In this way, different response estimators can be used to minimize noise at the system input or output. This also enables computation of other functions such as coherence, phase, group delay, coherent power and non-coherent power. Extensive data processing is normally available in both the time and frequency domains. It is possible to improve measurement S/N by averaging and delay compensation. Special care is needed when applying this method to telephones that are time variant or employ non-linear signal processing. 4101 G.2.2 4102 4103 4104 4105 4106 4107 4108 Without cross spectrum capabilities, the system input and output are measured separately. These response measurements require control of the excitation spectrum and/or a two-pass analysis. Therefore, measurement S/N due to noise at the system input or output is not improved. Any post-processing features available will apply only to the directly measured spectra, not to the response function. Special care is needed when applying this method to telephones that are time variant or employ non-linear signal processing. This method requires the stimulus to be stable between measurement of the system input (or calibration) and measurement of the system output. 4109 G.2.3 4110 4111 4112 4113 4114 4115 4116 The MLS technique employs a large (typically 16K) well-defined pseudo-random pulse excitation. The length of the excitation signal is equal to the correlation length, eliminating leakage. The MLS excitation and analysis are inherently synchronized. The received response signal is cross-correlated with the MLS signal, typically using a fast Hadamard transform, to obtain the time response. An FFT is then used to obtain the frequency response. This also enables computation of coherence, phase, group delay, coherent power and non-coherent power. Some non-linear analysis capabilities and post-processing are available. This method can improve measurement S/N. 4117 G.3 Real-time filter analysis (RTA) 4118 4119 4120 4121 4122 Real-time analysis is essentially a parallel filter bank, usually implemented digitally. This results in a constant percentage (logarithmic) frequency resolution. The analysis is carried out in parallel and the signal is processed continuously. The filters shall be 1/12 or 1/24 octave, which comply with the ANSI S1.11 standard. The statistical accuracy of real-time measurements is usually determined by the averaging time or the confidence level. This type of analysis is optimized for single-port acoustical measurements (i.e., no control of the system input). Care should be taken in the proper windowing of the data (i.e., Hanning, flat-top, etc.), overlap processing, and the number of averages, to ensure an accurate analysis. The record length and window type determine the frequency resolution. The frequency range and time resolution are inversely related. Because the data is discrete, the highest frequency that can be measured is determined by the sampling frequency. Some degree of data processing is usually available in both the time domain and in the frequency domain. An FFT analyzer can also have a zoom capability, for increased frequency resolution across a restricted bandwidth. When analyzing a periodic signal such as pseudo-random noise or a segment of real or artificial speech or artificial voices, the averaging time shall be at least one full period of the signal. Averaging time shall be stated for all measurements. Dual-channel FFT Single-channel FFT Maximum length sequence (MLS) analysis Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 103 IEEE P269/D25 October 2004 4123 4124 4125 4126 4127 When analyzing a periodic signal such as pseudo-random noise or a segment of real or artificial speech or artificial voices, the averaging time shall be at least one full period of the signal. Averaging time shall be stated for all measurements. 4128 G.3.1 4129 4130 4131 4132 Two channels enable simultaneous measurement of the system input and output, for direct computation of the frequency response (output/input). This method does provide limited harmonic distortion measurement capability, and some direct post-processing of the data. 4133 G.3.2 4134 4135 4136 4137 4138 A single-channel real-time analyzer requires separate measurements of the system input and output. Response measurements will require control of the excitation spectrum and/or a two-pass analysis. This method requires the stimulus to be stable between measurement of the system input (or calibration) and measurement of the system output. This method does provide limited harmonic distortion measurement capability, and some direct postprocessing of the data. 4139 G.4 Sine-based analysis 4140 4141 4142 4143 4144 4145 4146 4147 Sinusoidal excitation provides a high measurement S/N ratio and high degree of frequency selectivity. The analysis is performed serially using either a quadrature or rms detector. This often includes a tracking filter for noise suppression and selective measurements of distortion components. The quadrature detector multiplies the response signal by a synchronized (and appropriately delayed) sine and cosine signal. This enables measurement of the complex, steady-state frequency response (i.e., magnitude and phase, real and imaginary parts). Complex averaging algorithms can be employed to improve the measurement S/N ratio. The use of an rms detector requires a separate phase meter to obtain phase information. 4148 G.4.1 4149 4150 4151 4152 4153 4154 4155 4156 Discrete tone testing allows a measurement to be performed at precisely defined frequencies. These frequencies can be at the ANSI/ISO preferred numbers or in other user-defined formats. See ISO 3 and ANSI S1.6 for preferred number series. The actual frequency interval (not resolution) used in the measurement shall be stated. In addition to frequency response measurements, intermodulation and difference frequency distortion testing are often carried out using this method. Additionally, phase and group delay information is provided. These tests normally require an anechoic room, although tone-burst techniques can be used with gating to obtain simulated free field results. Measurement S/N can be improved using complex averaging. 4157 G.4.2 4158 4159 4160 4161 4162 This technique is similar to discrete tone testing, but instead employs a continuous linear or logarithmic sine sweep excitation. The measurement is typically slow due to sweep rate limitations. This method is well suited for frequency response and harmonic distortion measurements. An anechoic room is generally required, although toneburst techniques can be used with gating to obtain simulated free field results. 4163 G.4.3 4164 4165 4166 4167 4168 TDS, as classically implemented, utilizes a linearly swept sine excitation signal that is synchronized to the measuring instrument. With this signal, a one-to-one relationship is established between time and frequency and simulated free field measurements can be performed. The measured response signal is multiplied with an appropriately delayed version of the excitation. This, in turn, is fed to a selectable constant bandwidth tracking filter and a detector. Dual-channel real-time filter analysis Single-channel real-time filter analysis Discrete tone (stepped sine) Swept sine Time delay spectrometry (TDS) Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 104 IEEE P269/D25 October 2004 4169 4170 4171 4172 4173 4174 4175 4176 4177 4178 4179 4180 4181 4182 4183 In practice, TDS can be implemented by many modern techniques. For example, post-processing algorithms can substitute for the tracking filter. TDS can also be implemented using a logarithmic sweep followed by convolution. Like other simulated free field techniques, the effective time window determines frequency resolution and the lowest valid frequency. The time window is determined by the time between the arrival of the direct sound and the arrival of the first reflection. The TDS method also is well suited for harmonic distortion, and provides phase, group delay, and time response information. This method may be implemented using an analog or digital process. In the later case, refinements and corrections for deterministic errors in the measurement process may be incorporated. It is possible to improve measurement S/N through complex averaging or delay compensation. This method allows post-processing of the data. Special care is needed when applying this method to telephones that are time variant or employ non-linear signal processing. 4184 G.5 Simulated free field techniques 4185 4186 4187 4188 4189 4190 4191 4192 4193 Simulated free field techniques employ some method of time windowing the measured response. Time windowing enables the direct sound in a measurement to be separated from its reflections, producing a simulated free field condition. In this case, the frequency resolution is the reciprocal of the applied time window. Both gating and postprocess windowing can be used on measurements in ordinary rooms. 4194 G.6 Measurement bandwidth 4195 4196 4197 4198 4199 4200 4201 4202 4203 4204 4205 4206 4207 4208 4209 4210 4211 4212 4213 4214 4215 4216 4217 4218 4219 4220 In general, the test signals and analysis methods in this standard cover a frequency range from approximately 100 to 8500 Hz. The lower limit is determined by the mouth simulator, whose practical lower limit is approximately 100 Hz for general use. The upper limit is determined by the range of the DRP-to-ERP translation curve (Annex C). These limits may be somewhat modified when using standardized test signals which specify a particular bandwidth. The exact range also depends on the analysis method. For measurements of frequency response, the analysis should cover the same bandwidth as the test signal. As discussed previously, MLS and TDS are inherently simulated free field techniques. Dual-channel FFT analysis can also be used. The time windowing may be performed as a part of the data collection or as a post-processing window operation. For example, if artificial voices (F.6.1.1) are analyzed in 1/12th octave bands, the range should include the bands centered from 91.7 through 7286 Hz. In ITU-T Recommendation P.50, the test signal is defined for the 1/3 octave bands from 100 through 8000 Hz. The corresponding 1/12th octave bands extend from 91.7 through 8660 Hz. However, the version of artificial voices currently published in ITU-T Recommendation P.50, Appendix 1 is sampled at 16 kHz, thereby limiting the useful upper band to 7286 Hz. Other implementations of the artificial voices would have to be evaluated on a case-by-case basis with respect to sampling rate and other characteristics. If signals such as CSS (F.7.1) are analyzed in linear format, the range includes the lowest band at approximately 100 Hz, through approximately 8500 Hz. The frequency range for sinusoidal signals is from 100 through 8500 Hz. Digital telephones with a sampling rate of 8 kHz have an upper cutoff frequency just below 4 kHz. When testing telephones known to be of this type, the high frequency limit of test signals should be reconsidered. When using artificial voices or any signal with a speech-like spectrum, the full bandwidth should be used (up to approximately 8500 Hz.). Artificial voices and other speech-like signals have little long-term power above 4 kHz, so only a few hundredths of a dB total stimulus power is lost due to a cutoff slightly below 4 kHz. However, when using test signals with a relatively flat or pink spectrum (F.4 or F.5), the test signal should only extend to approximately 4 kHz. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 105 IEEE P269/D25 October 2004 4221 4222 4223 For noise measurements, the measurement bandwidth is nominally 25 Hz to 8500 Hz. The actual low frequency cut off is 22.4 Hz (the lower edge of the 25 Hz 1/3rd octave band) 4224 G.7 Measurement resolution 4225 4226 4227 4228 4229 4230 4231 4232 4233 4234 4235 4236 4237 4238 4239 4240 The standard frequency pattern for sinusoidal test signals is the R40 sequence. (See Table G. 1Table G. 1Table G. 1, Table G. 2Table G. 2Table G. 2 as well as ISO 3 and ANSI S1.6.) However, when testing digital devices, or devices which have any internal digital processing, some of these frequencies should be adjusted up to +/- 1% so they do not coincide with the sampling frequency, typically 8000 Hz, or submultiples thereof. An example would be to use 1004 Hz instead of 1000 Hz as a test tone. 4241 4242 4243 4244 4245 4246 4247 4248 4249 4250 4251 4252 4253 4254 4255 4256 4257 4258 4259 4260 4261 4262 4263 4264 The R10 frequency pattern is used for calculating loudness ratings. (See Annex H) Constant-percentage bandwidth filters with 1/3 or 1/12 octave bandwidth have center frequencies and passband upper & lower limit frequencies which are calculated by specific equations. See Table G. 1Table G. 1Table G. 1 and Table G. 2Table G. 2Table G. 2 for a complete list of 1/3 and 1/12 octave band frequencies within the scope of this standard. Exact center frequencies of 1/3 octave filters can be calculated according to Equation G. 2Equation G. 2Equation G. 2. The frequencies are actually based on 10 bands per decade. n / 10 f 10 Equation G. 2 Where: n is the band number. f is the frequency The 1/3 octave passband upper & lower limit frequencies can be calculated according to Equation G. 3Equation G. 3Equation G. 3. f 10n / 10 0.05 Equation G. 3 Example: For the 100 Hz band, the 1/3 octave band number = 20. The exact center frequency is 100 Hz, the lower limit is 89.13 Hz, and the upper limit is 112.20 Hz. For the 125 Hz band, the band number = 21. The exact center frequency is 125.89 Hz, the lower limit is 112.20 Hz, and the upper limit is 141.25 Hz. For 1/12 octave bands, the formulas are similar, except the centers are shifted one-half a band. This is done so that four 1/12 octave bands will cover the exactly same range as a 1/3 octave band encompassing them. The frequencies are actually based on 40 bands per decade, according to Equation G. 4Equation G. 4Equation G. 4. f 10 n 0.540 Equation G. 4 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 106 IEEE P269/D25 October 2004 4265 4266 4267 4268 4269 4270 4271 4272 4273 Example: 1/12 octave band number 80 has a center frequency of 102.92 Hz. The 1/12 octave passband upper & lower limit frequencies can be calculated according to Equation G. 5Equation G. 5Equation G. 5. f 10 n 0.5400.0125 Equation G. 5 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 107 IEEE P269/D25 October 2004 4274 R40 Preferred Frequencies, Hz. 90 95 100 106 112 118 125 132 140 150 160 170 180 190 200 212 224 236 250 265 280 300 315 335 355 375 400 425 450 475 500 530 560 600 630 670 710 750 800 850 900 950 1000 1060 1120 4275 4276 4277 4278 1/12 Oct. Band Center Freq, Hz. 91.73 97.16 102.92 109.02 115.48 122.32 129.57 137.25 145.38 153.99 163.12 172.78 183.02 193.87 205.35 217.52 230.41 244.06 258.52 273.84 290.07 307.26 325.46 344.75 365.17 386.81 409.73 434.01 459.73 486.97 515.82 546.39 578.76 613.06 649.38 687.86 728.62 771.79 817.52 865.96 917.28 971.63 1029.20 1090.18 1/3 Oct. Band Center Freq, Hz. R10 Preferred Frequencies, Hz. 100.00 100 125.89 125 158.49 160 199.53 200 251.19 250 316.23 315 398.11 400 501.19 500 630.96 630 794.33 800 1000.00 1000 Table G. 1 Frequency formats, first decade Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 108 IEEE P269/D25 October 2004 4278 4279 4280 4281 R40 Preferred Frequencies, Hz. 1/12 Oct. Band Center Freq, Hz. 900 950 1000 1060 1120 1180 1250 1320 1400 1500 1600 1700 1800 1900 2000 2120 2240 2360 2500 2650 2800 3000 3150 3350 3550 3750 4000 4250 4500 4750 5000 5300 5600 6000 6300 6700 7100 7500 8000 8500 9000 9500 10000 10600 11200 917.28 971.63 1029.20 1090.18 1154.78 1223.21 1295.69 1372.46 1453.78 1539.93 1631.17 1727.83 1830.21 1938.65 2053.53 2175.20 2304.09 2440.62 2585.23 2738.42 2900.68 3072.56 3254.62 3447.47 3651.74 3868.12 4097.32 4340.10 4597.27 4869.68 5158.22 5463.87 5787.62 6130.56 6493.82 6878.60 7286.18 7717.92 8175.23 8659.64 9172.76 9716.28 10292.01 10901.84 1/3 Oct. Band Center Freq, Hz R10 Preferred Frequencies, Hz. 1000.00 1000 1258.93 1250 1584.89 1600 1995.26 2000 2511.89 2500 3162.28 3150 3981.07 4000 5011.87 5000 6309.57 6300 7943.28 8000 10000.00 10000 Table G. 2 Frequency formats, second decade 4282 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 109 IEEE P269/D25 October 2004 4282 Annex H 4283 4284 (normative) 4285 4286 4287 4288 4289 4290 4291 4292 4293 4294 4295 4296 4297 4298 4299 4300 4301 4302 4303 4304 4305 4306 4307 4308 4309 Loudness Rating Calculations ISO R10 format data is required for calculating loudness ratings according to ITU-T Recommendation P.79. Measured frequency responses (receive, send, sidetone, etc.) should be directly converted to R10 format for this purpose. Although it has been common practice to remeasure at the R10 frequencies only for the purpose of calculating loudness ratings, this practice is neither necessary or desirable. The conversion procedure in this annex makes remeasurement unnessary. Measurement at the R10 points is not always desirable, since undersampling can occur. While this is not likely to introduce much error when the frequency response is smooth, when the frequency response is irregular the undersampling error can be larger. Irregular frequency response it not generally desirable, but it may be more likely in devices with digital signal processes running than in some types of simple analog systems. Leakage correction is not used for Type 2 and Type 3 ear simulators. Historically, a leakage correction was used to calculate loudness ratings on a Type 1 ear simulator. Measurements may be performed in various frequency formats, depending upon the analysis method employed. Response measurements can contain numerous peaks and dips. This conversion, therefore, should be performed u s i ng“ ba n d-a v e r a g i n g ” .Th eme a s u r e dpoi n t swi t h i napa r t i c u l a r1/ 3oc t a v eba n da r e“ powe ra v e r a g e d”a c c or di ngt o Equation H. 1Equation H. 1Equation H. 1, and assigned to the R10 frequency at the band center. At each ISO R10 preferred frequency 1 H ( f ) 10 log 10 N 4310 4311 4312 4313 4314 4315 4316 4317 4318 4319 4320 4321 4322 4323 4324 4325 4326 4327 4328 4329 4330 Hi 10 10 i 1 N Equation H. 1 where H’ ( f ) f N i Hi = response at the new preferred ISO R10 frequency = preferred ISO R10 frequency = number of response values within the 1/3 octave band centered at f = index for each response value within the 1/3 octave band = measured response value (in dB) For the lowest frequency within the band, i = 1. For the highest included frequency, i = N. The 1/3 octave passband limit frequencies can be calculated according to Equation H. 2Equation H. 2Equation H. 2: f 10( n /10) 0.05 Equation H. 2 where n is the band number. Example: For the 100 Hz band, the band number = 20; For the 125 Hz band, the band number = 21, etc. See also Annex G.7. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 110 IEEE P269/D25 October 2004 4331 4332 4333 4334 4335 4336 4337 For measured data at frequencies coinciding with a band-edge frequency (i = 1 and/or i = N), reduce the value by 3 dB, and use that data point in both the upper and lower frequency band calculations. For constant percentage bandwidth measurements, there will always be the same number of points for each converted band (4 or 8, for 1/12 or 1/24 octave bands, respectively). For constant bandwidth data (e.g., FFT) on a log frequency axis, the measurement data will appear under sampled at low frequencies and over sampled at higher frequencies. 4338 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 111 IEEE P269/D25 October 2004 4338 Annex I 4339 4340 (normative) 4341 4342 4343 4344 4345 4346 4347 4348 4349 4350 4351 4352 4353 4354 4355 4356 4357 4358 4359 4360 4361 4362 4363 4364 4365 4366 4367 4368 4369 4370 4371 4372 4373 4374 4375 4376 4377 4378 4379 4380 4381 4382 4383 4384 4385 4386 4387 4388 Linearity Linearity is a measure of how frequency response changes with input level. The test consists of measuring the relevant frequency response, but performing the measurement at several different stimulus levels. If the telephone is linear, the frequency response should be the same regardless of the stimulus level. Frequency responses are to be measured according to Clauses 7-9 (for example, Clause 7.4.1). The purpose of this method is to give a complete overview of the linearity of a device over a wide frequency and dynamic range, all in one graph. The method is a particular combination of measurements, post-processing and display procedures. The stimulus intervals and frequency patterns for linearity measurements have been specified in the body of this standard (for example, Clause 7.4.4). These parameters have been selected to reveal typical nonlinearities over the basic frequency and dynamic range of typical devices, without taking too much measurement time. For additional investigation of specific behaviors, these parameters may be altered. For example, it may be useful to use a much smaller stimulus interval, say 1 dB, for a more detailed look at the dynamic behavior of a device. If sharp resonances are to be investigated, a more dense frequency pattern, such as 1/12th octaves or R40, might be useful. Linearity shall be measured using the same stimulus type used to measure frequency response (send, receive, sidetone, or overall). When using artificial voices, the linearity measurement includes the effects of anything nonlinear, whatever the cause. Nonlinearities could be intentional or unintentional compression or expansion, distortion of various kinds, or other nonlinear processes. The linearity measurement shows if nonlinearity occurs, as well as the level and frequency range where it occurs. To analyze the cause, further investigation is required. However, the common patterns are shown in the figures in this annex. The linearity test shall be performed at 7 levels, in 5 dB intervals. Smaller intervals and/or a wider range of levels may also be used. The reference stimulus level shall be specified. Each individual measurement is processed according to Equation I. 1Equation I. 1Equation I. 1: C G x Gr ( x r ) Equation I. 1 where C = displayed linearity curve Gx = frequency response in dB at stimulus level x Gr = frequency response in dB at reference stimulus r x = the stimulus level in dB r = the reference stimulus level in dB For a linear phone measured with artificial voices, the result is 7 parallel lines at levels from 0 to –30 dB relative to the reference stimulus (see Figure I. 1Figure I. 1Figure I. 1). If the measurement is made with sine waves, the result Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 112 IEEE P269/D25 October 2004 4389 4390 4391 4392 4393 is 7 parallel lines at levels from –15 to +15 dB relative to the reference stimulus (see Figure I. 2Figure I. 2Figure I. 2). Nonlinearities are displayed as variations from the parallel lines (see Figure I. 4Figure I. 4Figure I. 4 through Figure I. 7Figure I. 7Figure I. 7). Reference Stimulus -4.7dBPa 0 -5 dB -10 -10 -15 -20 -20 -25 -30 -30 100 4394 4395 4396 4397 4398 4399 200 500 1k 2k 5k 10k Frequency (Hz) Figure I. 1 Linear phone measured with artificial voices 20 +15 +10 10 +5 dB Reference Stimulus -11.7dBPa 0 -5 -10 -10 -15 -20 100 4400 4401 4402 4403 4404 4405 4406 4407 4408 4409 200 500 1k 2k 5k 10k Frequency (Hz) Figure I. 2 Linear phone measured with sine wave Each displayed curve is a relative frequency response which shows any deviations from linearity. Each curve is displaced vertically by the amount the stimulus level differs from the reference stimulus. The linearity information for the entire frequency and dynamic range is shown in one graph. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 113 IEEE P269/D25 October 2004 4410 15 Output dB 0 -15 -15 4411 4412 4413 4414 4415 4416 4417 4418 4419 4420 4421 4422 4423 4424 4425 -10 -5 0 +5 +10 +15 Input, dB Figure I. 3 Linearity displayed as ordinary input-output curve at one frequency (for information only) If an imaginary vertical line were drawn through all the curves of Figure I. 1Figure I. 1Figure I. 1 or Figure I. 2Figure I. 2Figure I. 2 at a particular frequency, it would intersect the points typically displayed in a one-frequency input/output curve. In that case, the intersected points would be the y-values, and the stimulus levels would be the x values, as in Figure I. 3Figure I. 3Figure I. 3. In Figure I. 1Figure I. 1Figure I. 1 and Figure I. 2Figure I. 2Figure I. 2, the same information is displayed at all frequencies in one graph. Figure I. 4Figure I. 4Figure I. 4 through Figure I. 7Figure I. 7Figure I. 7 show examples of nonlinearities measured according to this method. 20 +15 +10 10 +5 dB Reference Stimulus -21dBV 0 -5 -10 -10 -15 -20 100 4426 4427 4428 4429 4430 4431 200 500 1k 2k 5k 10k Frequency (Hz) Figure I. 4 Receiver with compression at low-frequency resonance, measured with sine waves Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 114 IEEE P269/D25 October 2004 Reference Stimulus -16dBV 0 -5 dB -10 -10 -15 -20 -25 -20 -30 100 4432 4433 4434 4435 4436 4437 200 500 1k 2k 5k 10k Frequency (Hz) Figure I. 5 Wideband compressor with 1.5 to 1 ratio, measured with artificial voices 10 +15 +10 Reference Stimulus LMID +5 dB 0 -5 -10 -10 -15 -20 100 4438 4439 4440 4441 200 500 1k 2k 5k 10k Frequency (Hz) Figure I. 6 Headset with limiter, measured with artificial voices, 15 dB re LMID Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 115 IEEE P269/D25 October 2004 20 +15 +10 10 +5 dB Reference Stimulus -21dBV 0 -5 -10 -10 -15 -20 100 4442 4443 4444 4445 4446 4447 200 500 1k 2k 5k 10k Frequency (Hz) Figure I. 7 High frequency limiting due to overload in pre-emphasis circuit, measured with sine waves 4448 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 116 IEEE P269/D25 October 2004 4448 Annex J 4449 4450 (normative) 4451 4452 Distortion 4453 4454 4455 [need to finish integrating this section and its relationship with annex F and all other references in doc about preferred method (formally SDN). Decide whether SDN is it a distortion percentage or described in dB (make words of formula agree)] 4456 J.1 4457 4458 4459 4460 4461 4462 4463 4464 4465 4466 4467 4468 4469 4470 4471 4472 4473 4474 4475 4476 Distortion is a measure of unwanted signals which appear at the output of a device at frequencies not present in the input. Distortion is a function of input level, frequency, and the type of signal. Because of this, different methods cannot necessarily be expected to correlate with each other. 4477 J.2 4478 4479 4480 4481 4482 4483 4484 4485 To test the suitability of a proposed distortion test signal, the signal should be applied at each distortion test frequency using the standard level. The frequency response should then be measured at those test frequencies. If the result is within ±2 dB of the comparable values previously obtained in the complete frequency response measurement, then the proposed distortion test signal is suitable. 4486 J.3Signal-to-distortion-and-noise ratio (SDN) 4487 4488 4489 4490 4491 4492 4493 4494 The recommended distortion test method for this standard is signal-to-distortion -and-noise ratio. This method uses a narrow-band pseudo-random noise as the stimulus, and analyzes THD + noise with a weighted notch filter. See Equation J. 1Equation J. 1 and Equation J. 2Equation J. 2. Overview The recommended method for all telephones is signal-to-distortion-and-noise ratio (SDN), defined in Clause A.1.1J.3. It uses a narrow-band pseudo-random noise as the stimulus, and analysis of THD + noise with a weighted notch filter. Distortion test methods using sinewave stimulus may be suitable for use on many handsets and headsets and on some telephones. Sine methods and extensions of sine methods are described in clause J.3J.4. Continuous spectrum distortion methods may be a suitable alternative under some conditions where artificial voices or other continuous-spectrum test signals are used, and cross-spectrum methods are valid. See clause J.4J.5. Subjective predictors, such as algorithms which estimate mean opinion scores (MOS), may also be useful in identifying distortions and degradations peculiar to digital processing. These algorithms have generally been developed primarily for measurements of distortions found in networks, and may not be completely applicable to telephones or headsets. The results may not correlate directly with other measures. However, their use is encouraged as a supplemental investigation. One example is PESQ (ITU-T Recommendation P.832) Signal suitability test Distortion does not have to be measured using the same test signal as is used for measuring frequency response, but the suitability test shall be fulfilled. The narrow-band pseudo-random noise should have an effective bandwidth of 25 to 50 Hz. Out-of-band signals should add no more than 0.5 dB to the overall level of the test signal. The periodic nature of this signal will provide some modulation effect, depending on how the signal is constructed. The period should be at least 250 ms, with frequency components no more than 4 Hz apart. The crest factor should be 9±3 dB. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 117 IEEE P269/D25 October 2004 4495 4496 4497 4498 4499 4500 4501 4502 4503 4504 4505 4506 The output fundamental is measured with a bandpass filter or equivalent algorithm. Measurement is made using an A-weighting filter according to ANSI S1.4-1983 (R1997), but with a notch added to eliminate the test signal. (Send distortion may be measured using the psophometric weighting if required by the relevant performance standard.) Output from the notched filter includes harmonics and nonharmonic products, as well as both continuous noise and modulation noise. The notch filter output is divided by the fundamental and expressed in percent, using Equation J. 1Equation J. 1 and Equation J. 2Equation J. 2. The result is the A-weighted signal-to-distortion-and-noise ratio. The notch shall attenuate the test signal by at least 50 dB. This will result in a distortion floor of 0.3%, permitting measurements of distortion from 1% and above with 6% or better accuracy. % SDN 4507 100 output from weighted notch filter narrow band noise stimulus 4508 4509 4510 4511 4512 Equation J. 1 % SDN 4513 4514 4515 4516 4517 4518 4519 4520 4521 4522 4523 4524 4525 4526 100 W ( f ) { ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 ( Anoise ) 2 } A1 Equation J. 2 Where An = amplitude of nth product Anoise = amplitude of wideband noise and nonharmonic products W(f) = amplitude weighting function (A-weighting with a notch) Measurements should be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies from 315 Hz to 3150 Hz. Test frequencies over one half the upper frequency limit of the telephone may not be useful for evaluation of harmonic distortion. For high acoustic test levels, verify that the distortion of the test system is less than 2%. 4527 J.4J.3 Sinusoidal Methods 4528 4529 4530 4531 4532 4533 4534 4535 4536 4537 4538 4539 4540 4541 4542 4543 Note to committee: add ANTHD, no restriction on harmonics? (digital phones bandwidth vs harmonic #) (see linearity). Add to definitions, ANTHD.The sinusoidal methods may be used with a sine, modulated sine or narrowband pseudo-random noise as the stimulus. The choice of stimulus is discussed in greater detail in annex J.1 and J.2 [fix up stimulus references…] For discussions on modulation, see annex F.3. Narrow-band pseudo-random noise should have an effective bandwidth of 25 to 50 Hz. Out-of-band signals should add no more than 0.5 dB to the overall level of the test signal. The periodic nature of this signal will provide some modulation effect, depending on how the signal is constructed. The period should be at least 250 ms, with frequency components no more than 4 Hz apart. The crest factor should be 9±3 dB. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 118 IEEE P269/D25 October 2004 4544 J.4.1J.3.1 Total harmonic distortion (THD) and harmonic analysis 4545 4546 4547 4548 4549 4550 4551 4552 4553 4554 4555 Total harmonic distortion is the ratio of the power sum of all the harmonics to the fundamental. It is usually expressed as a percentage, according to Equation J. 3Equation J. 3Equation J. 3 - Equation J. 6Equation J. 6Equation J. 6. Harmonics may also be expressed separately to give diagnostic information in addition to THD. Harmonic analysis may be done using bandpass filters, or an equivalent algorithm. Equations J.3 and J.4 are preferred. % THD 4556 100 power sum of included harmonics fundamental 4557 4558 4559 4560 4561 Equation J. 3 % THD 4562 4563 4564 4565 4566 4567 4568 100 ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 A1 Equation J. 4 Equations J.5 and J.6 may be used as an aAlternatively. For low values of distortion the results are similar to that obtained by using equations J.3 and J.4. For higher values of distortion the values will differ., % THD 4569 100 power sum of included harmonics power sum of fundamental and included harmonics 4570 4571 4572 4573 Equation J. 5 % THD 100 4574 ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 ( A1 ) 2 ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 4575 4576 4577 4578 4579 Equation J. 6 Where 4580 J.4.2J.3.2 4581 4582 4583 4584 4585 4586 THD + Noise is the ratio of the rms amplitude of the residual harmonics and noise to the rms amplitude of the fundamental, harmonics and noise combined. (Equation J. 7Equation J. 7Equation J. 7 and Equation J. 8 Equation J. 8 Equation J. 8.) It is usually expressed as a percent. An = amplitude of nth product Total Harmonic Distortion (THD) and noise Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 119 IEEE P269/D25 October 2004 4587 4588 4589 4590 4591 4592 4593 4594 Total harmonic distortion and noise is measured by use of a notch (bandstop) filter to eliminate the fundamental. This measurement will be equivalent to total harmonic distortion, with an error of less than 5%, if the magnitude of the distortion does not exceed 30%, and if there is no significant noise component. The notch shall attenuate the test signal by at least 50 dB. This will result in a distortion floor of 0.3%, permitting measurements of distortion from 1% and above with 6% or better accuracy. % THD Noise 100 4595 output from notch filter unfiltered total output 4596 4597 4598 4599 Equation J. 7 % THD Noise 100 4600 4601 4602 4603 4604 4605 4606 4607 4608 ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 ( Anoise ) 2 ( A1 ) 2 ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 ( Anoise ) 2 Equation J. 8 Where An = amplitude of nth product Anoise = amplitude of wideband noise and nonharmonic products 4609 J.3.3 4610 4611 4612 4613 4614 4615 4616 4617 4618 4619 4620 4621 4622 4623 4624 4625 4626 4627 4628 The signal-to-distortion-and-noise ratio method uses a sine, modulated sine or narrow-band pseudo-random noise as the stimulus, and analyzes THD + noise with a weighted notch filter. See and . 4629 Signal-to-distortion-and-noise ratio (SDN) The narrow-band pseudo-random noise should have an effective bandwidth of 25 to 50 Hz. Out-of-band signals should add no more than 0.5 dB to the overall level of the test signal. The periodic nature of this signal will provide some modulation effect, depending on how the signal is constructed. The period should be at least 250 ms, with frequency components no more than 4 Hz apart. The crest factor should be 9±3 dB. The output fundamental is measured with a bandpass filter or equivalent algorithm. Measurement is made using an A-weighting filter according to ANSI S1.4-1983 (R1997), but with a notch added to eliminate the test signal. (Send distortion may be measured using the psophometric weighting if required by the relevant performance standard.) Output from the notched filter includes harmonics and nonharmonic products, as well as both continuous noise and modulation noise. The notch filter output is divided by the fundamental and expressed in percent, using and . The result is the A-weighted signal-to-distortion-and-noise ratio. The notch shall attenuate the test signal by at least 50 dB. This will result in a distortion floor of 0.3%, permitting measurements of distortion from 1% and above with 6% or better accuracy. % SDN 100 output from weighted notch filter narrow band noise stimulus 4630 4631 4632 4633 Equation J. 91 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 120 IEEE P269/D25 October 2004 4634 % SDN 4635 4636 4637 4638 4639 4640 4641 4642 4643 4644 4645 4646 4647 4648 4649 4650 4651 4652 4653 4654 4655 4656 4657 4658 4659 4660 4661 100 W ( f ) { ( A2 ) 2 ( A3 ) 2 . . . ( An ) 2 ( Anoise ) 2 } A1 Equation J. 102 Where An = amplitude of nth product Anoise = amplitude of wideband noise and nonharmonic products W(f) = amplitude weighting function (A-weighting with a notch) Measurements should be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies from 315 Hz to 3150 Hz. Test frequencies over one half the upper frequency limit of the telephone may not be useful for evaluation of harmonic distortion. For high acoustic test levels, verify that the distortion of the test system is less than 2%. J.3.4 Amplitude normalized total harmonic distortion (ANTHD) ANTHD is an alternative method which makes it possible to separate the nonlinear transducer distortions from the linear distortions of the system under test. Linear distortions include the frequency response of the speaker or receiver and how it is coupled to the ear. ANTHD is generally not preferred for most telecom measurements since it may mask poor distortion performance in devices that have poor low frequency performance. Amplitude Normalized Total Harmonic Distortion (ANTHD): The ratio of the square root of the sum of all of the squared second, third, and higher harmonic amplitudes, at their harmonic frequencies, (normalized to the amplitude of the fundamental at the same frequencies) to the amplitude of the fundamental. For this document ANTHD is calculated as a percentage using the second and third harmonics. 2 4662 4663 4664 4665 4666 4667 4668 4669 4670 4671 4672 4673 4674 4675 4676 4677 4678 4679 2 2 A ( f ) A3 ( f ) A ( f ) % ANTHD 100 2 ... n A1 ( 2 f ) A1 (3 f ) A1 ( nf ) Equation J. 119 Where: Total Distortion (TD) is the power sum of all the harmonics (Error! Not a valid link.), which may or may not be included in the calculation of % ANTHD. Total Distortion ( A2 ) 2 ( A3 ) 2 ... ( An ) 2 Equation J. 1210 And: n is the harmonic number A1(nf) is the amplitude of the fundamental at frequency n• f. An (f) is the amplitude of the nth harmonic at excitation frequency f. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 121 IEEE P269/D25 October 2004 4680 J.4.3J.3.5 Difference-frequency distortion (DF Distortion) 4681 4682 4683 4684 4685 4686 4687 4688 Difference-frequency distortion is measured by using two stimulus signals, typically spaced from 20 to 200 Hz apart. A complex group of distortion products results, consisting of odd and even order products. (Equation J. 13Equation J. 11Equation J. 11 and Equation J. 14Equation J. 12Equation J. 12) It is essentially the same as the production sidebands in a mixer or modulator. Difference-frequency distortion tests may be the best way to evaluate a telephone above 1000 Hz, where the harmonics of a single tone (or narrow-band pseudo-random noise signal) l i ea bov et h es e t ’ sc u t of ff r e qu e n c y . 4689 % Total DF Distortion 100 power sum of included products power sum of both stimulus signals 4690 4691 4692 4693 Equation J. 1311 % Total DF Distortion 100 4694 4695 4696 4697 4698 4699 4700 ( A2 ) 2 ( A3 ) 2 ( A3 ) 2 ( A4 ) 2 ( A5 ) 2 ( A5 ) 2 . . . ( A f 1 ) 2 ( A f 2 ) 2 Equation J. 1412 Where An = amplitude of nth product Afn = amplitude of nth stimulus signal products 4701 J.4.4J.3.6 Intermodulation distortion (IM Distortion) 4702 4703 4704 4705 4706 Intermodulation distortion measurement typically uses one test tone at a fixed low frequency, such as 60 Hz, together with a second tone stepped or swept through the band of the device. Intermodulation distortion measurement is not recommended for use with telephone products operating in the normal speech band. It may be usable in wideband telephony, but that has not been studied for use in this standard. 4707 J.4.5J.3.7 4708 4709 4710 4711 4712 4713 4714 4715 4716 4717 4718 4719 4720 4721 4722 Harmonic and difference-frequency distortion measurement methods can be extended for more appropriate application to telephone and headset testing, where a sinusoidal stimulus is not always suitable. 4723 J.4.6J.3.8 4724 4725 Measurements should be made over a range of frequencies within the telephone band, such as the ISO R10 preferred frequencies from 315 Hz to 3150 Hz. Test frequencies over one half the upper frequency limit of the telephone may Alternatives to sinewave stimulus signals One alternative is to use modulated sine waves as the stimulus. A square wave, sine wave, or a pseudo-random modulation can be used to modulate the sine wave signals. Refer to Clause F.3 for details. One modulated sinewave is used for harmonic distortion, while two are used for difference-frequency distortion. Another alternative is to use a narrow-band pseudo-random noise signal as the stimulus. One narrow-band noise signal is used for harmonic distortion measurements, while two narrow-band noise signals are used for differencefrequency distortion. The total stimulus level is calculated on a power basis. See clause A.1.1J.3 for details about the narrow-band noise stimulus. When using these alternative test signals, analysis is with rms detectors and bandpass filters, or equivalent algorithm. Test frequencies Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 122 IEEE P269/D25 October 2004 4726 4727 4728 not be useful for evaluation of harmonic distortion. For high acoustic test levels, verify that the distortion of the test system is less than 2%. 4729 J.5J.4 Coherence methods (N/C Ratio) 4730 4731 4732 4733 4734 4735 Conventional techniques for measuring harmonic and intermodulation distortion are not usable in continuous spectrum methods. An alternative is to use the ratio of noncoherent to coherent power (N/C), each summed over the most important part of the telephone bandwidth of 300 –3300 Hz. (Equation J. 15Equation J. 13Equation J. 13). This method is suitable if, and only if, the telephone or headset under test has a stable coherent frequency response. (Magnitude and phase are stable.) % Continuous Spectrum Distortion (N/C) 4736 4737 4738 4739 4740 4741 4742 4743 4744 4745 4746 4747 4748 4749 4750 4751 4752 4753 4754 4755 4756 4757 4758 4759 4760 4761 4762 4763 4764 4765 noncoheren t power (300 3300Hz) coherent power (300 3300Hz) Equation J. 1513 Coherent power is the power in the output spectrum that is linearly related to the input. Noncoherent power is the remainder. The following can cause this nonlinear remainder: 1. 2. 3. 4. 5. Nonlinearity in the telephone under test. Noise in the telephone or measurement system. Analysis leakage due to an inappropriate time window or insufficient measurement resolution. Multiple inputs or multiple outputs. Uncompensated delay between input and output. An analyzer cannot distinguish among these factors, so care is needed in setting up the measurement and in interpreting the results. Factors 3, 4, and 5 can be largely eliminated by proper measurement setup. A separate measurement of noise in the device under test, summed over the telephone bandwidth of 300 –3300 Hz, should be made with the continuous spectrum test signal deactivated. If this noise is significantly less than the noncoherent power, then the noncoherent power is due to nonlinearity in the device and Equation J. 16Equation J. 14Equation J. 14 is valid. Another method for interpreting the N/C ratio is to perform the measurement at different levels and compare the results. For example at moderate levels, the N/C ratio will usually be at its lowest, indicating relatively low noise as well as relatively low nonlinearity. At low levels, the N/C ratio typically increases due to noise. At high levels, the N/C ratio normally increases due to nonlinearity. Further equations and definitions: noncoherent power coherent power (1 2 ) Gbb 2 Gbb (1 2 ) 2 Gaa Gbb Gab 4766 4767 4768 Gab 2 2 Equation J. 1614 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 123 IEEE P269/D25 October 2004 4769 4770 where 2 Coherence Gab 2 Gaa Gbb 4771 4772 Gaa input autospectrum Gbb output autospectrum Gab cross spectrum 4773 4774 4775 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 124 IEEE P269/D25 October 2004 4775 Annex K 4776 4777 (normative) 4778 4779 Send Signal-to-Noise Ratio 4780 4781 K.1 Send signal-to-noise ratio 4782 4783 4784 4785 4786 4787 4788 4789 4790 4791 4792 4793 4794 4795 4796 4797 4798 Send signal-to-noise ratio, SendSNR(f), is a measure of the desired speech transmission relative to unwanted noise i nt h er oom whe r et h et a l k e r ’ sph on e ,h a n ds e torh e a ds e ti su s e d.Th eme a s u r e me n ti si n t e n de dt oa ppl yt obot h passive and active systems. SendSNR(f) is given by equation Equation K. 1Equation K. 1Equation K. 1. Two test signals are used for this measurement. The first is the desired speech signal, presented from the mouth simulator. The signal and positioning should be the same as used to determine send frequency response (7.5.1). The second is a noise signal presented in a diffuse field (5.5.3). This noise signal may be Hoth noise (Annex E) or any other noise signal representative of actual working conditions. The DFTP and the MRP shall coincide. The desired speech signal is presented together with the diffuse noise signal to obtain GSETP(S+N)(f). The diffuse noise signal is presented alone, to obtain GSETP(N)(f). The results are sensitive to the relative levels of the both signals, and may be sensitive to the absolute levels and types of signals used. The results may also be sensitive to the spectrum of the test signals. The recommended noise spectrum is Hoth noise, at –4.7 dBPa. The recommended speech signal test level is also –4.7 dBPa. SendSNR ( f ) 4799 4800 4801 4802 4803 4804 4805 4806 4807 4808 G SETP ( S N ) ( f ) G SETP ( N ) ( f ) 10 10 log 10 1 in dB Equation K. 1 for: GSETP(S+N)(f) > GSETP(N)(f) where: inactive. GSETP(S+N)(f) is the rms spectrum at SETP with both the mouth simulator and noise sources active GSETP(N)(f) is the rms spectrum at SETP with only the noise source active. The mouth simulator present, but 4809 K.2 Weighted send signal-to-noise ratio 4810 4811 4812 4813 Weighted send signal-to-noise ratio, SendSNRw, is a single number which results from applying an intelligibility weighting WSNR (Table K. 1Table K. 1Table K. 1) to the SendSNR (Equation K. 2Equation K. 2Equation K. 2). 4814 SendSNRW f 5000 SendSNR( f ) WSNR f 200 4815 4816 4817 4818 Equation K. 2 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 125 IEEE P269/D25 October 2004 4818 1/3 octave band center frequency 200 250 315 400 500 630 800 1000 1250 1600 2000 2500 3150 4000 5000 4819 4820 4821 4822 4823 4824 Weighting WSNR .012 .030 .030 .042 .042 .060 .060 .072 .090 .112 .114 .102 .102 .072 .060 Table K. 1 Intelligibility weightings 4825 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 126 IEEE P269/D25 October 2004 4825 Annex L 4826 4827 (normative) 4828 4829 Delay 4830 4831 L.1 General 4832 4833 4834 4835 4836 Delay can be measured in several ways, many of which are described in this clause. Electroacoustical delays in the test equipment, such as the mouth simulator, can generally be ignored. The range of delay that can be measured by the test equipment must exceed the expected delay in the device under test, or time domain aliasing may occur. The method used should be stated with the measurement. 4837 L.2 Captured pulse method 4838 4839 4840 4841 4842 4843 Delay can be measured using a captured pulse. The pulse can be a swept sine or a gated sine. The recommended timing for a pulse is 30 to 50ms on and 500 to 800ms off. This timing allows measuring equipment, such as a digital storage oscilloscope, to acquire sufficient data for a clean measurement. The pulse is delivered to the input test point and triggers the time capture. Record the difference in time between the start of the input pulse and the start of the measured pulse at the output test point. 4844 L.3 Two-channel analyzer methods 4845 L.3.1 4846 4847 4848 4849 4850 4851 4852 Measure the impulse response. Delay between channels is the time at which the magnitude of the impulse response is at its maximum. The delay between two events is the time difference between the maxima of the two impulse responses. 4853 L.3.2 4854 4855 4856 4857 Measure the cross-correlation. Delay between channels is the time at which the cross-correlation coefficient is at its maximum. The delay between two events is the time difference between the maxima of the two impulse responses. If available on the analyzer, the magnitude of the cross correlation should be used rather than the real part. 4858 L.4 Time Delay Spectrometry Method 4859 4860 4861 4862 4863 4864 4865 Measure the impulse response. Delay between channels is the time at which the magnitude of the impulse response is at its maximum. The delay between two events is the time difference between the maxima of the two impulse responses. Impulse response method The magnitude of the impulse response is calculated as the square root of the sum of the squares of the impulse response (real part) and the Hilbert transform of the impulse response (imaginary part). Cross-correlation method The magnitude of the impulse response is calculated as the square root of the sum of the squares of the impulse response (real part) and the Hilbert transform of the impulse response (imaginary part). Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 127 IEEE P269/D25 October 2004 4866 L.5 MLS Method 4867 4868 4869 4870 4871 4872 4873 Measure the impulse response. Delay between channels is the time at which the magnitude of the impulse response is at its maximum. The delay between two events is the time difference between the maxima of the two impulse responses. The magnitude of the impulse response is calculated as the square root of the sum of the squares of the impulse response (real part) and the Hilbert transform of the impulse response (imaginary part). 4874 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 128 IEEE P269/D25 October 2004 4874 Annex M 4875 4876 (normative) 4877 4878 4879 4880 4881 4882 4883 4884 4885 4886 4887 4888 4889 4890 4891 4892 4893 4894 4895 4896 4897 4898 4899 4900 4901 4902 Sidetone Echo In some phones there may be an audible delay in the sidetone path. This delay may be heard as an unnatural quality and/or as an echo. The perceived quality can depend on the amount of delay, the amplitude and spectrum of the delayed sidetone, and the amplitude and spectrum of the local (acoustic) sidetone. Sidetone delay is measured between the mouth simulator and the ear simulator, using one of the methods described in Annex L. If the delay is 5ms or less, talker sidetone may be measured in the standard way (7.6.1 or 8.6.1). If the delay exceeds 5ms, the local (undelayed) sidetone and the sidetone echo should be measured separately, using one of the simulated free field techniques described in Annex G.5. In this application the time window is used to separate the local sidetone from the sidetone echo, not necessarily to simulate a free field. To measure local sidetone, the window should begin at approximately 0ms, depending on the exact shape of the time window. The window should be as long as possible without including the sidetone echo. To measure sidetone echo, the window should begin just before the onset of the echo, depending on the exact shape of the time window. The window should be as long as possible without including the sidetone echo The true frequency resolution of a simulated free field measurement will be determined by the time window chosen. The effective time window should be at least 5.7 ms, which corresponds to a frequency resolution (lowest measurable frequency) of 175 Hz. Both local sidetone frequency response and sidetone echo frequency response are defined similarly to Equation 7.7Equation 7.7Equation 7.4 in 7.6.1. The exact formula depends on the method chosen. 4903 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 129 IEEE P269/D25 October 2004 4903 Annex N 4904 4905 (informative) 4906 4907 Maximum Acoustic Pressure Limits 4908 4909 N.1 Abstract 4910 4911 4912 4913 4914 4915 4916 4917 4918 4919 4920 4921 4922 4923 4924 4925 4926 4927 Both North American and European acoustic pressure limits for telephone headsets are under review. Two new limits at ERP (Ear Reference Point) and DRP (Eardrum Reference Point) are proposed. The new limits are based on the generally accepted 85 dBA 8-hour TWA (Time-Weighted-Average) free-field exposure limit. The TWA allows the exposure limit to increase 3 dB for each time the exposure duration is cut in half, e.g. 88 dBA for 4 hours, 91 dBA for 2 hours and so on and so forth. With a 2 second duration (as specified in ITU-T Recommendation P.360) the allowable free-field exposure level is 127 dBA. Subtract 4 dB from 127 dBA to compensate for narrower telephony bandwidth compared to the free-field broad frequency bandwidth. The maximum allowable exposure level for telephone for a 2 second duration is 123 dBA. The new proposed acoustic pressure limits for headset at ERP and DRP are then obtained by applying the ERP and DRP transfer functions to the 123 dBA free-field limit across the frequency bandwidth. The proposed limits also suggest adding the A-weighting coefficients to simplify actual tests. 4928 N.2 Introduction 4929 4930 4931 4932 4933 4934 4935 4936 4937 4938 4939 4940 4941 4942 The two most common telephone headset acoustic pressure limits are the North American frequency dependent curves at ERP and DRP and the European 118 dBA flat (independent of frequency) at ERP. The proposal contained in this Annex is a procedure for deriving new telephone headset acoustic pressure limits that combine the best aspects of both current North American and European limits. The specific numbers and coefficients, such as the selection of the transfer functions and the damage risk factor should be further examined and discussed. Hopefully, this proposal will help in resolving years of differences over the proper telephone headset acoustic pressure limit on both sides of Atlantic Ocean. The North American limit curves were based on United States OSHA (Occupational Safety and Health Administration) 90 dBA 8-hour TWA free-field noise exposure limit. OSHA allows the exposure limit to increase 5 dB for each time the exposure duration is cut in half, e.g. 95 dBA for 4 hours, 100 dBA for 2 hours and so on and so forth. With a 15-minute duration the allowable free-field exposure level is 115 dBA. OSHA regulates the maximum free-field exposure limit at 115 dBA. In 1980, Bell Labs published two telephone headset acoustic pressure limits for ERP and DRP in its PUB 48006. The limits were obtained by transferring the OSHA 115 dBA free-field limit to ERP and DRP and adding Aweighting coefficients across the frequency bandwidth. Presently, the Bell Labs limits are known as the North American telephone headset acoustic pressure limits. These limits are shown in Figure N. 1Figure N. 1Figure N. 1 and Figure N. 2Figure N. 2Figure N. 2. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 130 IEEE P269/D25 October 2004 140 135 130 dBS PL 125 120 115 110 105 100 100 1000 10000 Frequency (Hz) 4943 4944 4945 4946 4947 Figure N. 1 Bell Labs telephone headset acoustic pressure limit at ERP 140 135 130 dBS PL 125 120 115 110 105 100 100 4948 4949 4950 4951 4952 4953 4954 1000 Frequency (Hz) Figure N. 2 Bell Labs telephone headset acoustic pressure limit at DRP Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 131 10000 IEEE P269/D25 October 2004 4955 4956 4957 4958 4959 4960 4961 4962 4963 4964 4965 4966 4967 4968 4969 4970 4971 4972 4973 ITU-T Recommendation P.360 explains the derivation of the European 118 dBA limit. This limit was based on an 85 dBA 8-hour TWA free-field noise exposure limit. (Th i si s5dB l owe rt h a nOSHA’ s90dBA l i mi t . )Th e allowable limit increases 3 dB for every halving of exposure duration. (OSHA uses a 5 dB increment.) The following additional assumptions have been made in ITU-T Recommendation P.360 to adapt these limits to telephone usage: a) For the 2-second duration, the allowable limit is 127 dBA. b) 10dBi ss u bt r a c t e df r omt h e127d BAl i mi tbe c a u s eof“ n on-oc c u pa t i on a le x pos u r e ” . c) Another 4 dB is subtracted to compensate for narrower telephony bandwidth compared to the free-field broad frequency bandwidth. d) 5dBi sa dde dt ot h el i mi tt oa c c ou n tf or“ s oun df i e l d”di f f e r e n c e( t h edi f f e r e n c ebe t we e nERPa n df r e e field). Thus, 127 –10 –4 + 5 = 118 dBA. The limit is shown in Figure N. 3Figure N. 3Figure N. 3. 140 135 130 dB S PL 125 120 115 110 105 100 100 1000 10000 F requency (Hz) 4974 4975 4976 4977 4978 4979 4980 4981 4982 4983 4984 4985 Figure N. 3 Current European telephone headset acoustic pressure limit at ERP Bot ht h eNor t hAme r i c a na n dEu r ope a nl i mi t sh a v et h e i rs t r e n g t h sa n ds h or t c omi ng s .TheNor t hAme r i c a n ’ sERP and DRP limits were based on OSHA’ soc c u pa t i on a ln oi s ee x pos u r el i mi t s .Th e90dBA 8-hour TWA free-field limit has been called too high. Neither the 5 dB increment for every halving of duration, nor the absolute maximum of115dBA,a r ewi de l ya c c e pt e d.Ne v e r t h e l e s s ,Ame r i c a n ’ sme t h odofu tilizing frequency dependant transfer functions to transfer the free-field limit to ERP and DRP limits is correct. The European limit is based on 85 dBA 8-hour TWA free-field limit that is generally accepted. Its increment of 3dB for every halving of dura t i oni smor ea c c e pt e dt h a nOSHA’ s5dBi n c r e me n t .Howe v e r ,t r a n s f e r r i ngf r e e -field limit Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 132 IEEE P269/D25 October 2004 4986 4987 4988 to ERP by simply adding 5 dB without frequency dependency is hardly justifiable. Subtracting 10 dB from the limit f or“ n on-oc c u pa t i on a le x pos u r e ”i sa l s oqu e s t i on a bl e . 4989 N.3 Proposal 4990 4991 4992 4993 4994 4995 4996 4997 4998 4999 5000 5001 5002 5003 5004 The North American and European limits can be combined. Since 85 dBA 8-hour TWA free-field exposure limit is more accepted globally, it should be adopted for the new limits. The 3dB increment for every halving of duration is also more generally accepted and should also be adopted. Applying these assumptions at a 2 second duration as specified in ITU-T Recommendation P.360 gives a limit of 127 dBA in free-field. Subtracting 4 dB from the 127 dBA to compensate the narrower telephony bandwidth, as done in ITU-T Recommendation P.360, reduces the limit to 123 dBA. Applying the ERP and DRP transfer functions and adding the A-weighting coefficients to this 123 dBA free-field limit across the frequency bandwidth, as done in the North American method, produces the new proposed ERP and DRP telephone headset acoustic pressure limits, shown in Figure N. 4Figure N. 4Figure N. 4 and Figure N. 5Figure N. 5Figure N. 5. Th e10d B“ da ma g er i s k ”r e du c t i ons pe c i f i e di nI TU-T Recommendation P.360 needs to be re-considered. A reduction to 1/2 of the energy is 3 dB, reduction to 1/4 of the energy is 6 dB. Figure N. 4Figure N. 4Figure N. 4 and Figure N. 5Figure N. 5Figure N. 5 show the preliminary proposed limits at ERP and DRP and the limits with a 3 dB and 6 dB safety margin. P reliminary P roposed H eadset Acoustic P ressure Limits at E R P 140 135 dBS P L 130 125 120 115 110 105 100 100 1000 10000 Fre que ncy (Hz ) w/o S afety M argin 5005 5006 5007 5008 5009 5010 w/ 3dB S afety M argin w/ 6dB S afety M argin Figure N. 4 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 133 IEEE P269/D25 October 2004 P reliminary Proposed H eadset Acoustic Pressure Limits at D R P 140 135 dBS P L 130 125 120 115 110 105 100 100 1000 10000 Fre que ncy (Hz) w/o S afety M argin 5011 5012 5013 5014 5015 5016 5017 5018 5019 w/ 3dB S afety M argin w/ 6dB S afety M argin Figure N. 5 This proposal offers a procedure for deriving new telephone headset acoustic pressure limits that combine the best aspects of both current North American and European limits. The specific numbers and coefficients, such as the selection of the transfer functions and safety margin, should be further examined and discussed. 5020 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 134 IEEE P269/D25 October 2004 5020 Annex O 5021 5022 (normative) 5023 5024 Temporally weighted terminal coupling loss measurement method 5025 5026 5027 5028 5029 5030 5031 5032 5033 5034 5035 5036 5037 5038 5039 5040 5041 5042 5043 5044 5045 5046 5047 5048 5049 5050 5051 5052 5053 5054 5055 5056 5057 5058 5059 5060 5061 5062 5063 O.1 General The temporally weighted terminal coupling loss (TCLT) measurement method is described for single-talk application. This method requires that the echo and the source signal be recorded over the duration of the measurement, and post processing be used. Real-time measurement techniques are possible, but are not described in this Standard. Freezing the canceller is not recommended for TCL tests. Test results with non-stationary signals have shown that convergence times and subsequent converged TCL when "thawed" depend upon the point in time at which the canceller was frozen. TCLT, is intended to: a) Provide a measure of time dependent echo return loss with peaky behavior, psycho-acoustically weighted b) Provide an estimate of the number of potentially objectionable echo bursts, and the psychoacoustically weighted echo return loss during the bursts c) Provide several other useful parameters describing echo, including long-term temporally weighted terminal coupling loss, single talk (LTCLT ) O.2 Initial signal processing An example test algorithm in pseudo code is detailed in Annex P. The rest of this clause defines the method and gives some background information. The echo signal is first filtered to model the frequency sensitivity of human hearing at low levels. The echo and stimulus files are synchronized. Noise subtraction may then be applied, if it can be assumed that the noise is stationary and not correlated to the echo. Echo and source are converted into 4 ms power averaged frames allowing adequate resolution and immunity to synchronization errors. If the stimulus is inactive, the algorithm simply skips that frame, and moves on to the next echo and stimulus frames. If the stimulus is declared active, the echo frame is compared with a threshold to determine if an echo event occurs. The period of echo activity between inactive echo states is termed an echo "event". These events are then weighted using psycho-acoustic modeling. By using a threshold of –67.2 dBV (-65 dBm) (5 dB above law noise floor), TCLT can be determined. 5064 O.3 Modeling echo audibility 5065 5066 In modeling echo audibility, the algorithm accounts for 3 fundamental aspects of human hearing behavior: frequency weighting, temporal combination and temporal weighting. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 135 IEEE P269/D25 October 2004 5067 5068 5069 O.3.1 Frequency weighting 5070 5071 5072 5073 5074 5075 5076 The frequency sensitivity of human hearing at a loudness level of 30 Phons is approximated. (30 Phons is equivalent to 30 dB at 1 kHz). 5077 O.3.2 5078 5079 5080 5081 5082 5083 5084 5085 5086 5087 5088 5089 Temporal combination is the ear's tendency to combine the loudness of sequential signals even though they may be discrete in time. This typically occurs when the two signals are separated by less than about 20 ms. The exact time is a complex function of many variables, but 20 ms is a suitable value in this application. This is sometimes referred to as the Haas effect. 30 Phons was chosen as it represents echo levels that result from terminals that just fail handset terminals coupling loss specifications (determined using loss planning analysis). Variance from 20 to 50 Phons provide essentially the same weighting within the telephony band. An A-weighting filter is used. See ANSI S1.4-1983 (R 1997). Temporal combination If two bursts of echo are separated by a period of inactivity less than 20 ms, they are considered as one longer echo event as far as loudness is concerned. This continues until the gap between events is at least 20 ms, at which time the echo event is declared over. This can be thought of as a 20 ms hangover for the current echo event. During this hangover period, echo and stimulus powers are not included as part of the event. An example of temporal combination follows in Figure O. 1Figure O. 1Figure O. 1: New Echo Duration of Echo = 100 ms Echo Amplitude (Power) Temporal Combination 20 Activity Threshold 40 60 80 100 120 Time (20 ms/div) 5090 5091 Figure O. 1 Temporal combination 5092 5093 5094 O.3.3 Temporal weighting 5095 5096 5097 5098 5099 Te mpor a lwe i gh t i ngmode l st h el i s t e n e r ’ sr e du c e ds e ns i t i v i t yt os oun dsa st h e i rdu r a t i onde c r e a s e sbe l ow 750ms . The exact time is a complex function of many variables, but 750 ms is a suitable value in this application. The duration of the total echo event after temporal combination is measured. The total duration includes any gap(s) between events that are captured by temporal combination, but not the final 20 ms hangover. If the total duration is Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 136 IEEE P269/D25 October 2004 less than 750 ms, the level of the event is reduced to account for the temporal integration behavior of human hearing. If the duration is longer than 750 ms, the level of the total event is left unweighted. Test results have shown echo bursts less than 750 ms to be common occurrences from cancellers. A simplified equation (Equation O.1) describing the relationship was derived based upon audition studies with noise. (Tones result in a slightly different relationship, but it was felt that noise was a much closer approximation to the true nature of the echo than a sine.) Temporal integration weighting = -23 + 8log(t), in dB Equation O.1 Where: t = total duration of echo event (ms), t 750 ms A graphical representation of temporal weighting is shown in Figure O. 2Figure O. 2Figure O. 2. Relative Loudness Level (dB) 5100 5101 5102 5103 5104 5105 5106 5107 5108 5109 5110 5111 5112 5113 5114 5115 5116 5117 0 -10 -20 Broadband Noise 10 5118 5119 5120 5121 5122 5123 5124 100 Duration (ms) 1000 Figure O. 2 Temporal weighting 5125 O.4 Expressing TCL Results 5126 5127 5128 5129 5130 5131 5132 5133 Traditional TCL methods refer the echo power during the duration of measurement to the source power during the duration of measurement to arrive at the terminal coupling loss. In the TCLT method, the final weighted power of echo during each event is referred to the power of the source signal during the same event, to arrive at the "Active TCLT", or ATCLT, of each event. The echo is referred to the source signal during the event only, as this is the way in which our ear would compare the echo. This parameter can be statistically analyzed to give information about echo events during the entire test sequence. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 137 IEEE P269/D25 October 2004 5134 5135 5136 5137 5138 5139 5140 5141 5142 5143 5144 5145 5146 5147 5148 5149 5150 5151 5152 5153 5154 A long term average of the weighted active echo return loss is found by summing the power of all weighted echo during active events, and comparing to the power of the source as seen during all events only. The result is the "Active Long Term TCLT," or ALTCLT. For comparison with traditional TCL methods, the power of all weighted echo during events is summed, then referred to the total source power as measured for the entire duration of the measurement. The result is the "Long Term TCLT," or LTCLT. The terminology for TCLT results was chosen to be consistent with the nomenclature of ITU-T recommendation P.56 (1993). Other statistics compiled by the algorithm in Annex P include minimum, maximum, mean and standard deviation of ATCLT, the total number of echo events, the number of echo events per minute, the percentage of echo event free speech, number of events < 750 ms, and the average length of an event and the duration of source inactivity. 5155 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 138 IEEE P269/D25 October 2004 5155 Annex P 5156 5157 (normative) 5158 5159 Temporally weighted terminal coupling loss algorithm 5160 5161 5162 5163 5164 5165 5166 5167 5168 5169 5170 5171 5172 5173 5174 5175 5176 5177 5178 5179 5180 5181 5182 5183 5184 5185 5186 5187 5188 5189 5190 5191 5192 5193 5194 P.1 General This algorithm is an example of how to implement the measurement of TCLT as defined in Annex O. The algorithm is provided as an assistance to the test developer, but it is not the definition of TCLT. Modifications to this algorithm may be made, and may be necessary, to completely fulfill the intent of Annex O. TCLT is a newly proposed method for evaluating the echo return loss of a terminal using psychoacoustic modeling and for predicting the occurrences of potentially objectionable echoes. The principles are defined in Annex O. It incorporates 3 fundamental aspects of human audition: a) frequency sensitivity of human hearing for low-level sounds b) temporal addition of level for events within 20 ms of each other c) temporal integration for stimuli below 750 ms Speech based stimulus signals are recommended as their results are most representative of real world usage. The measured output from the telephone is always some echo or noise making its way through the system uncancelled. It may be useful to record the stimulus and echo in digital format. Echo and stimulus frames shall be calibrated according to the principles of this standard. It is possible to apply this method to 2-wire analog sets by use of a test hybrid. (See IEEE Std 1329-1999) The stimulus and the echo files will be processed as power values averaged over 4 ms frames. The successive stimulus file frames will be termed xi, the echo frames will be denoted yi, where i = 1, 2, 3.... is the actual frame index. Intermediate frames conforming to an "echo event" will be noted as xk, and yk, where k = 1, 2, 3... is the echo event index, and is reset when the event ends a new one commences. Statistics compiled during the TCLT measurement include the Active Long Term TCLT (ALTCLT), Long Term TCLT (LTCLT), minimum and maximum Active TCLT (MINTCLT, MAXTCLT), its standard deviation (sigma) and mean, the total number of echo events (NEVENTS), the number of echo events per minute (NEVMIN), the percentage of echo event free speech (PER), number of events < 750 ms (N750), the average length of an event (AVGEVENT), and the duration stimulus was inactive (DUR). The terminology for TCLT results was chosen to be consistent with the nomenclature of ITU-T recommendation P.56 (1993). The duration of stimulus inactivity is not included in the time-based results. 5195 P.2 TCLT Algorithm 5196 5197 Stimulus and measured results shall be calibrated according to the requirements in Clauses 6-9. 5198 P.2.1 5199 5200 Calculate the correlation of stimulus and echo file to fine tune EPD (echo path delay). See Annex L for methods. Use the criteria that the present correlation peak occurs at EPD unless a following correlation peak has a magnitude Step 1: measure EPD Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 139 IEEE P269/D25 October 2004 5201 5202 5203 at least 10 dB greater. This approximate guideline is based upon subjective studies on delay detection with multiple impulses. 5204 P.2.2 5205 5206 Align the echo and stimulus files in time by removing delay equal to EPD from the echo file. 5207 P.2.3 5208 5209 The individual echo samples are A-weighted filter. (See ANSI S1.4-1983 (R 1997). 5210 P.2.4 5211 5212 5213 5214 5215 If it can be assumed that the noise in the echo path is stationary and uncorrelated with the echo, the noise is measured for 2 seconds after the stop of source and echo activity. The noise is then subtracted, on a power basis, from the echo plus noise to arrive at a better estimate of the echo alone. This procedure shall be performed only if the echo plus noise is at least 3 dB greater than the noise alone. 5216 P.2.5 5217 5218 5219 5220 Samples are converted to absolute numbers using the calibration data. The stimulus samples are combined into 4 ms power averaged frames denoted as xi. The weighted, noise filtered echo samples are combined into 4 ms power averaged frames denoted as yi. 5221 P.2.6 5222 5223 5224 5225 5226 5227 5228 5229 5230 5231 5232 5233 5234 5235 5236 5237 5238 5239 5240 5241 5242 5243 5244 Initialize variables: i = 0 (frame counter) j = 0 (frame counter for inactive signal duration) nk=0 = 0 (number of frames in current echo event) NSAMPS = 0 (accumulated number of frames for all events) HAAS = 0 (counter up to 20 ms) ei=0 = 0 (running summation of all echo power for all events after weighting, as seen at frame counter i) pi=0 = 0 (running summation of all stimulus power during the measurement, as seen at frame counter i) ek=0 = 0 (running summation of echo power during the particular echo event after weighting, as seen at event frame counter k) sk=0 = 0 (running summation of stimulus power during the particular echo event after weighting, as seen at event frame counter k) WEIGHT = 0 (temporal based weight of most recent event) LEVENT = 0 (echo return loss level of most recent event, after weighting) NEVENT = 0 (total number of echo events) N750 = 0 (total number of echo events < 750 ms) MINTCL = 75 (minimum echo return loss level of all events) MAXTCL = 0 (maximum echo return loss level of all events) EVENT[NEVENT] = 0 (initialize array for all event loss levels (in dB) to zero; used to calculate sigma) TEMPSK = 0 (running sum of stimulus power during all events) SUM = 0 (used in calculating sigma) SQ = 0 (used in calculating sigma) Step 2: align signals Step 3: apply A-weighting Step 4: subtract noise (conditional) Step 5: 4ms frames Step 6: initialization Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 140 IEEE P269/D25 October 2004 5245 P.2.7 Step 7: calculations 5246 5247 5248 5249 5250 5251 5252 5253 5254 5255 5256 5257 5258 5259 5260 5261 5262 5263 5264 5265 5266 5267 5268 5269 5270 5271 5272 5273 5274 5275 5276 5277 5278 5279 5280 5281 5282 5283 5284 5285 5286 5287 5288 5289 5290 5291 5292 5293 5294 5295 5296 5297 5298 Increment frame counter and read in 4 ms averaged echo power yi, and 4 ms averaged stimulus power, xi; if there are no more valid inputs and either measurement file is complete, go to Step 8: calculate parameters. 1 i = i +1 (unless last i, then go to Step 8: calculate parameters) Sum stimulus powers pi = pi + xi Is stimulus loud enough for a valid echo loss calculation? If not, disregard present frame and move to next frame. 4 If xi < (long term stimulus rms level - 25 dB) j=j+1 i=i+1 Go to 4 Else Test echo against threshold If yi -67.2 dBV (-65 dBm) _ (5 dB above law noise floor) Increment frame event counter k = k +1 Increment frame event length including any gaps < 20 ms nk = nk +1 + HAAS Reset "Haas kicker" HAAS = 0 Accumulate echo power of event ek = ek + yi Accumulate stimulus power during event sk = sk + xi Go to 1 Else Has there been no event within last 20 ms? If k=0 HAAS = 0 Go to 1 Else There has been an event within the last 20 ms HAAS = HAAS + 1 Has 20 ms without an event elapsed after a recent event? If HAAS*4 < 20 Go to 1 Else An event is over, add an event to the event counter NEVENT = NEVENT + 1 Increment the total events duration counter by adding the duration in frames of the most recent event NSAMPS = NSAMPS + nk Was the most recent event duration < 750 ms? If nk*4 < 750 Calculate temporal integration weighting for most recent echo event WEIGHT = 8*log10(nk*4) - 23 Increment the counter for the number of events that were temporally weighted N750 = N750 +1 Else Calculate weighted echo return loss of the most recent event in dB LEVENT = 10*log10(sk/ek) - WEIGHT Store the minimum and maximum echo return losses in dB IF LEVENT < MINTCL; MINTCL = LEVENT IF LEVENT > MAXTCL; MAXTCL = LEVENT Store the echo return loss of the most recent event in dB for future sigma calculation Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 141 IEEE P269/D25 October 2004 5299 5300 5301 5302 5303 5304 5305 5306 5307 5308 5309 5310 5311 5312 5313 5314 EVENT(NEVENT) = LEVENT Reconvert the echo return loss of the most recent event into linear; recalculate weighted linear echo power ek = sk/(10**(LEVENT/10)) Accumulate all the echo event powers for future use in calculating ALTCLt and LTCLt ei = ei + ek Accumulate all the stimulus powers during events for future use in calculating ALTCLt TEMPSK = TEMPSK + sk Reset echo event variables k=0 nk = 0 WEIGHT = 0 HAAS = 0 ek = 0 sk = 0 Go to 1 5315 P.2.8 5316 5317 5318 5319 5320 5321 5322 5323 5324 5325 5326 5327 5328 5329 5330 5331 5332 5333 5334 5335 5336 5337 5338 5339 5340 Calculate Active Long Term TCLt (ALTCLt), Long Term TCLt (LTCLt), the number of echo events per minute (NEVMIN), the percentage of echo event free speech (PER), the average length of an event (AVGEVENT) and duration during which speech was inactive (DUR). 5341 P.2.9 5342 5343 5344 Step 8: calculate parameters Note: Zero check ei before computing; if ei = 0, set ALTCLt and LTCLt to 100 dB. ALTCLt = 10*log10(TEMPSK/ei) LTCLt = 10*log10(pi/ei) NEVMIN = 60*NEVENT/((i-j)*0.004) {number of events per minute} PER = 100*((i-j) - NSAMPS)/(i-j) {percentage of echo free speech) AVGEVENT = NSAMPS*4/NEVENT {average length of an event in milliseconds} DUR = j**0.004 Calculate sigma by analyzing the EVENT array which contains the echo return loss of each event; each event, regardless of duration, is given equal weighting in the sigma calculation; the suggestion is that it is the transition between discreet events and not their duration that is most objectionable. Loop j from 1 to NEVENT SUM=SUM+EVENT(j) SQ=SQ+EVENT(j)**2 ENDLOOP SIGMA = SQRT(SQ/NEVENT - [SUM/NEVENT]**2) Calculate mean of the events MEAN = SUM/NEVENT Step 9: output statistics Print ALTCLt, LTCLt, MINTCL, MAXTCL, NEVENT, NEVMIN, PER, N750, AVGEVENT, DUR, SIGMA, MEAN 5345 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 142 IEEE P269/D25 October 2004 5345 Annex Q 5346 5347 (normative) 5348 5349 5350 5351 5352 5353 5354 5355 5356 5357 5358 5359 5360 5361 5362 5363 5364 5365 5366 5367 5368 5369 5370 5371 5372 5373 5374 5375 5376 5377 Simulated Speech Generator (SSG) Main Signal The main signal consists of eight 1024-point pseudo-random noise segments. Each segment has the same magnitude spectrum but a different phase spectrum with the phase randomized within and between the segments uniformly from 0 to 360 degrees, in order to randomize the interaction between the intermodulation products of the harmonically related spectral components. The duration of each segment is 80 ms. They are merged with each other through a raised cosine window, with an additional 80 ms. merging segment between them. The simultaneous fadeout of the previous segment and the fade-in of the following segment eliminate the transients, which would occur at the segment boundaries. The complete main signal thus consists of eight pseudo-random segments interleaved with eight merging segments, each of 80 ms. Duration, having a total length of 1.28 seconds. A simple filter at the output provides the desired frequency shaping to approximate an average speech spectrum. Modulating Signal Measurements show that a Gamma distribution with parameter m = 0.545 provides a good approximation to the instantaneous amplitude distribution of continuous speech. The syllabic characteristics can be represented by a low pass response that is practically flat up to about 4 Hz (the -3 dB point) followed by -6 dB per octave roll-off. The final wave shape of the modulating signal was derived empirically from the Gamma distribution. Varying the period of this pulse in a pseudo-random manner and adjusting its rise and fall time ratio results in a satisfactory approximation to the spectrum of the modulation envelope of real speech. Combined Signal In order to extend the repetition time of the final signal and to spread more evenly the maxima of the modulating signal over the repeated sequence of the Gaussian signal, the ratio between the sampling clock frequencies of both signals was chosen to be 4/255. Thus the clocking frequency of the main signal is 12,800 Hz, and the clock frequency for the modulating signal is about 200.8 Hz. The repetition times are: .28 seconds for the Gaussian signal, 10.2 seconds for the modulating signal and 326.4 seconds for the final modulated signal. Main Signal Source (Gaussian) Shaping Filter Output Modulating Signal Source (Gamma) 5378 5379 5380 5381 5382 5383 5384 Figure Q. 1 Block diagram of simulated speech generator Gaussian Signal Generator - Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 143 IEEE P269/D25 October 2004 5385 5386 5387 5388 5389 5390 5391 5392 The Gaussian signal is made up of sixteen segments. The odd number segments are generated by filling a 2 by n array with zeros and then filling in the desired real and imaginary spectrum components using equations one and two. The first entry is zero i.e. no DC component and there are no components above 5500 Hz. 5393 5394 5395 5396 5397 5398 5399 5400 5401 Equation Q. 2 5402 5403 5404 5405 5406 5407 5408 5409 5410 5411 5412 5413 5414 5415 5416 5417 5418 5419 5420 5421 5422 5423 5424 5425 5426 5427 5428 5429 5430 5431 5432 X r cos 2 Equation Q. 1 X i sin 2 where: is a random number with uniform dostribution 0 1 The inverse FFT is then taken to transfer the signal to the time domain. x n X r X i Equation Q. 3 The even number segments S(n) are: Si(n) =Si(n-1)*0.5(1+cos(((i-0.5)/1024) + Si(n+1)*0.5(1-cos(((i-0.5)/1024) i = 1 to 1024 n = 2, 4...,16 for n+1>16 use n+1-16 Gamma Function: For the Gamma function the 2048 samples are divided into 21 random length pulse periods (number of samples). The periods are 167, 43, 63, 119, 48, 57, 78, 88, 93, 107, 51, 71, 259, 60,67, 207, 143, 54, 130, 45, 98. Each period is divided into rise time of one third and a fall time of two thirds. That is, rise and fall times are in 1:2 ratio. The cubic interpolating spline function is used to model the rising and falling section of each segment. First calculate the coefficients B(I), C(I), D(I) for I =1 to 60 for a cubic interpolating spline (G.E. Forsythe, M.A. Malcolm, and C.B. Moler [L3]). The number of points (knots) is 60. The abscissas of the knots, in increasing order, range in value from 0.05648176 to 0.983219. Y is the ordinate of the knots. Y (I) =I-0.5. where: n = number of samples in the rising (or falling) section s(i) is the value of the ith data point in the period For the rising time period: s(i) = spline value at abscissa (-0.5/n)+(1/n*i) For the falling time: s(i) = spline value at abscissa (-0.5/n)+(1/n*(n+1-i) 5433 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 144 IEEE P269/D25 October 2004 5433 Annex R 5434 5435 (normative) 5436 5437 5438 5439 5440 5441 5442 5443 5444 5445 5446 5447 5448 5449 5450 5451 5452 5453 5454 5455 5456 5457 5458 5459 5460 5461 5462 5463 TDS Sweep with P.50 Noise Bursts The bias signal consists of P.50 noise (F.5.3). For send measurements, it is presented in bursts at a 4 Hz rate and 50% duty cycle (125 ms "ON", 125 ms "OFF"). The bias is presented at the standard test level during the "ON" bursts. For receive measurements, the bias may be presented either continuously or in the burst pattern. Continuous presentation may be the most appropriate bias of a telephone with a simple AGC function, but burst presentation may be better for telephones with more complex functions. Ideally, both ways should be measured to determine which gives the most typical results. The telephone will be measured in its average state during the entire measurement. The measurement signal is a series of sine sweeps from 100 to 8500 Hz, at any rate suitable for Time Delay Spectrometry (TDS) measurements. The sweeps are not synchronized with the bias pulses. The sweep spectrum may approximate the P.50 spectrum. At 315 Hz, the level of the measurement signal is 15 dB below the overall level of the bias signal. The measurement is performed by TDS (G.4.3). The sweep length and number of averages are adjusted to obtain a satisfactory signal-to-noise ratio in the measurement. Typically, a measurement time (sweep length times number of averages) in the range of 16 to 128 seconds gives good results. The true frequency resolution of the TDS measurement will be determined by the time window chosen, not by the frequency interval in the analyzer. The minimum effective time window is 5.7 ms, which corresponds to a frequency resolution (lowest measurable frequency) of 175 Hz. In principle, this method can be used with any desired bias signal, including any of the speech-like signals (see F.6). 5464 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 145 IEEE P269/D25 October 2004 5464 Annex S 5465 5466 (informative) 5467 5468 5469 5470 5471 5472 5473 5474 5475 5476 5477 5478 5479 5480 5481 Use of the Free Field as the Telephonometric Reference Point Current performance requirements are based on measurements referred to the ERP. Future requirements may be based on measurements referred to the free field. This annex provides background information on this concept. One goal of a telephonic experience is to simulate a conversation where two people are one meter apart, talking to each other. Now insert a complete telephone system between our two talkers. In a perfect world, the quality of the conversation would be the same with a telephone system and in free space. This is called the orthotelephonic reference. Consider a loudspeaker with a perfectly flat free field frequency response through the audio band (Figure S. 1Figure S. 1Figure S. 1): Speaker Microphone Free Field Response (simplified) 100Hz 5482 5483 5484 5485 5486 5487 10K Figure S. 1 Play the same speaker into a HATS ear simulator, and the result is a 17 dB peak at 2.8 kHz. (For more complete data, see ITU-T Recommendations P.57 and P.58). See Figure S. 2Figure S. 2Figure S. 2. Speaker HATS Eardrum (DRP) to Free Field Transfer function (simplified) 100Hz 5488 5489 5490 5491 1K 1K Figure S. 2 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 146 10K IEEE P269/D25 October 2004 5492 5493 5494 5495 5496 5497 The HATS ear simulator replicates the resonances which occur in a typical human pinna and ear canal system, and measures at the (ear) Drum Reference Point or DRP. It is because of the pinna and the resonances in the ear canal that a loudspeaker with a flat free field response will not measure flat into a HATS, at the DRP. Therefore, if a telephone receiver or headset is to sound the same as a hypothetical flat speaker in the free field, the frequency response at the DRP should follow the freefield curve(s) referenced in ITU-T Recommendation P.57/58. (Figure S. 3Figure S. 3Figure S. 3) Phone on HATS Eardrum (DRP) to Free Field Transfer Function (simplified) 100Hz 5498 5499 5500 5501 5502 5503 5504 5505 5506 10K Figure S. 3 Most telephone companies are more familiar with the Type 1 ear simulator. This type of simulator uses the Ear Reference Point (ERP) rather than the DRP, which results in a different frequency curve shape. Using the above hypothetical receiver tested into a Type 1 ear simulator yields a frequency response which looks like Figure S. 4Figure S. 4Figure S. 4: Phone on Type 1 Ear Simulator 5507 5508 5509 5510 5511 5512 5513 5514 5515 5516 5517 5518 5519 1K ERP to Free Field Transfer Function (simplified) 100Hz 1K 10K Figure S. 4 The important thing to remember is that the above curves, using either Type 1 simulators or HATS, all can be referenced to a free field response. Another way of looking at it is that if you want your handset or headset to sound like a flat loudspeaker in the free field, e.g. simulating the orthotelephonic reference, the frequency response should look like either the ERP or DRP to free field transfer function curves above. The complete orthotelephonic response is due to the combination of frequency responses in the send, network, line, and receive paths of an overall (end-to-end) connection. The exact distribution of frequency response shaping in these paths is outside the scope of this Annex. 5520 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 147 IEEE P269/D25 October 2004 5520 Annex T 5521 5522 (informative) 5523 5524 Useful Conversion Procedures 5525 5526 5527 5528 5529 5530 5531 5532 5533 5534 5535 5536 5537 5538 5539 5540 5541 5542 5543 5544 5545 5546 5547 5548 5549 5550 5551 5552 5553 5554 5555 5556 5557 5558 5559 5560 5561 5562 5563 5564 5565 5566 5567 T.1 Conversions for dBV to dBm, and for 600 and 900 0 dBm is accepted as 1 mW, typically using a circuit impedance of 600 ohms or 900 ohms. 0 dBm = 10 log 1(mW) dBV = 10 log V2 = 20 log V For R = 600 ohms: P = V2/R, therefore dBm = 10 log ((V2/R) * 1000) = 10 log ((V2/600) * 1000) = 10 log V2/0.600 So, V = 774.6 mV or 0 dBm -2.22 dBV For R = 900 ohms: P = V2/R, therefore dBm = 10 log ((V2/R) * 1000) = 10 log ((V2/900) * 1000) = 10 log V2/0.900 So, V = 948.7 mV or 0 dBm -0.46 dBV To change from 600 ohms to 900 ohms or vice versa, for a constant voltage: Correction (dB) = -10 log (0.600/0.900) = 10 log (0.900/0.600) = 1.76 dB Correction (dB) = 10 log (|Z1| / |Z2|), i.e., the log of the ratio of the magnitude of the impedances, when converting from impedance Z1 to Z2. If converting from " Z1 = 600 ohms" to " Z2 = 900 ohms", the correction factor is -1.76 dB, thus we subtract 1.76 dB from the measurement. Depending on the impedance being used, conversion factors can be applied dB for dB to the measured or calculated result. Example 1: To convert a 600 ohm -20 dBm signal to dBV, simply subtract 2.22 to get -22.2 dBV. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 148 IEEE P269/D25 October 2004 5568 5569 5570 Example 2: -20 dBm is measured across 600 ohms. To find the level across 900 ohms, add a correction of -1.76 dB to get -21.76 dBm (since the larger load dissipates less power). 5571 T.2 Conversions for dBmp to dBrnC for electrical noise measurements 5572 5573 5574 5575 5576 5577 5578 5579 5580 5581 5582 Two weighted noise measurement units have typically been used in telephony, dBmp and dBrnC. The main differences between these two measurement units are the shape of the weighting filter and the reference unit. The weighting filter for dBrnC is described in IEEE Standard 743-1995. The differences in the weighting functions are extremely slight, as to be insignificant; thus the conversion between the two units can be expressed as: dBrnC = dBmp + 90 5583 T.3 Loudness rating conversions 5584 5585 5586 5587 5588 5589 5590 5591 5592 5593 5594 5595 5596 Conversion from loudness ratings defined in IEEE Standard 661-1979 to those defined in ITU-T Recommendation P.79 (1993), as specified by ANSI/TIA/EIA-810-A-2000, is as follows: 5597 T.4 Acoustic sound pressure conventions 5598 5599 5600 5601 5602 5603 5604 5605 5606 dBPa (dB pascals) dBSPL (dB Sound Pressure Level) SLR (P.79) = TOLR (IEEE 661) + 57 RLR (P.79) = ROLR (IEEE 661) - 51 STMR (P.79) = SOLR (IEEE 661) + 9 The above conversions should be used as an approximation only. These conversions are based upon approximated frequency response curves as specified in ANSI/TIA/EIA-810-A-2000. Proper conversion may depend upon actual measurements being made with each measurement standard where frequency responses deviate significantly from the norm. Where, 0 dBPa 94 dBSPL, and 0 dBSPL 20 micropascals, 1 Pa = 1 N/m2 An A-we i g h t e ds ou n dpr e s s u r el e v e li ndB( r e20mi c r opa s c a l s )i sof t e na bbr e v i a t e da s“ dBA” . 5607 Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 149 IEEE P269/D25 October 2004 5607 Annex U 5608 5609 (informative) 5610 5611 Loudness Balance Subjective Test Procedure 5612 5613 U.1 Introduction 5614 5615 5616 5617 5618 5619 5620 5621 5622 5623 5624 5625 5626 The results of a subjective loudness balance test procedure may be used to estimate the receive loudness in those cases where objective measurements do not correlate well with real use performance. This loudness balance subjective test procedure differs in specific test details but is similar to the CCM laboratory "Contra-Lateral Balance" procedure. The procedure has been used to obtain loudness differences between a reference headset receiver and four test headset receivers. All of the headsets had on-ear type receivers. The standard deviations of the loudness balances obtained from 10 subjects ranged from 1.8-4.9 dB, and averaged 2.7 dB over 23 trials. (A trial consisted of four loudness balances for each of 10 subjects for one sound source and one test headset.) The accuracy of the average loudness differences obtained in the tests for the four test headsets was represented by 95% confidence intervals about the average of 2.1 dB. 5627 U.2 Loudness balance test procedure 5628 5629 5630 5631 5632 5633 5634 5635 5636 5637 5638 5639 5640 5641 5642 5643 5644 5645 5646 5647 5648 5649 5650 5651 5652 5653 5654 5655 The loudness balance procedure is used to obtain loudness differences between a test and reference headset. The receiver in the reference headset shall have objectively measured performance which correlates well with its real-use receive performance. With the type of artificial ears currently available, this requires a tight acoustic seal between the receiver and artificial ear during objective measurements, and between the receiver and human ear in real use. The methods described in this clause have been successfully used with headsets. In principle, similar methods can be used with handsets. The loudness balance tests should be performed in a quiet room with background noise no greater than 40 dBA. A loudness balance between the reference and test headsets is obtained by allowing the subject to adjust the signal level to the test receiver until loudness of the sound from the test receiver is judged equal to the loudness of the sound from the reference receiver. During this determination, the test receiver is on one ear and the reference receiver is on the other ear. After the loudness balance is determined, the loudness difference between the test and reference receivers is represented by the difference in signal levels to the two receivers. To counteract the effects of hearing acuity differences between the subject's left and right ears, the tests should be repeated with the test and reference headset receivers reversed on the subjects ears. The results of the two trials are averaged to determine the loudness difference. To obtain reasonably reliable data, a minimum of 10 subjects should be used in the tests. These t e s ts u bj e c t ss h ou l dh a v e“ c l i n i c a l l yn or ma l ”h e a r i n g .Th a ti s ,t h ema g n i t u deofme a s u r e dh e a r i ngl os sa ta nyt e s t frequency shall be less than 30 dB. If possible, each test subject should have approximately equal hearing in both ears. The loudness differences should be determined for six different signal sources consisting of one-third octave band noise centered at the following frequencies: 315 Hz, 500 Hz, 800 Hz, 1250 Hz, 2000 Hz, and 3150 Hz. The use of a narrow band of noise is preferred over pure tones since sounds that are normally heard are more complex than pure tones. Furthermore, subjects may adapt to pure tones after a short period of listening. This could result in inaccurate measurements. This adaptation is less likely when narrow band noise is used. Two loudness balances are made for each of the six signals for each ear. The signal sources are presented in a random order to the subject. The subject determines a loudness balance by adjusting an attenuator that controls signal level to the test headset receiver, while alternating the signal between the test and reference receivers with a switch. With each new signal, the starting signal level in the test receiver should always be below that of the Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 150 IEEE P269/D25 October 2004 5656 5657 5658 5659 5660 5661 5662 5663 5664 5665 5666 5667 5668 5669 5670 5671 5672 5673 5674 5675 5676 5677 5678 reference receiver. That is, the subject should always initially need to increase the test receiver level to arrive at a loudness balance. After completing the loudness balances for the first receiver - ear placement, the receivers are then reversed on the subject's ears and the tests repeated. 5679 U.3 Example test circuit 5680 5681 5682 5683 5684 5685 5686 5687 5688 A block diagram of an example test circuit for implementing the loudness balance tests is given in Figure U. 1Figure U. 1Figure U. 1. Amplifiers 1, 2, and 4 provide an impedance transformation function as well as providing gain. Amplifier 1 converts from the signal source impedance to the 600 ohm circuit impedance while Amplifier 2 and 4 convert from the circuit impedance to the headset receiver impedance, which is 300 ohm for this example. Switch 1 is a hand-held push button switch, which enables the subject to alternate the signal between the test and reference headsets. Attenuator 1 is adjusted by the subject to attain preferred listening levels in the reference headset receiver. Attenuator 2 is adjusted by experimenter to randomly shift the balance point. Attenuator 3 is adjusted by the subject to attain a loudness balance between the test and reference receivers. Loudness differences between some test headsets and the reference headset may be similar for the six test sounds. The subject may thus learn during the test to set the balance attenuator at a specific location to achieve a loudness balance. However, the subject's final decision may be influenced more by what he or she thinks is the correct position to produce a balance than by the actual balance itself. To prevent any such biasing of the results, a means should be incorporated in the test design to randomly shift the loudness balance point. Before the tests begin, the subject should be given ample time to adjust the headsets to his or her ears. The importance of proper receiver-to-ear coupling should be stressed to the subject and directions given not to change the positioning of the receivers once the tests begin. Each test subject should adjust the signal level to the reference receiver for his or her preferred listening level. After the receivers have been properly positioned, the 1250 Hz sound source should be directed to the reference headset and the subject instructed to adjust an attenuator until the sound is at his or her preferred level. This level for the reference headset should then remain constant for all sound sources for that subject. (When the test and reference receivers are reversed on the subject's ears, the subject is again asked to adjust the attenuator for preferred listening level.) In those cases where the test headset incorporates receive compression, it is necessary to determine, in pre- tests with the test and reference receivers, the signal level for the reference receiver. This level, which will probably be below the preferred level of most subjects, should be such that it prevents the acoustic output of the test receiver from being limited for at least 10 dB or so above the expected balance point for the six signal sources. Am plifier 2 TP 1 Attenuator 1 Source Signal Am plifier 1 Reference Headset ---Reference Switch 1 ---Test Attenuator 2 TP 2 Attenuator 3 Am plifier 3 5689 5690 5691 5692 5693 5694 5695 5696 Am plifier 4 Test Headset Figure U. 1 Loudness Balance Test Circuit For circuit line-up, the test and reference headset receive jacks are terminated at 300 ohm (in the example). Using a 1000 Hz tone, the gain of the amplifiers is adjusted, such that when the gain of Amplifier 3 is numerically equal to the sum of the losses of Attenuators 2 and 3, the voltage levels at TP1 and TP2 are equal. Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 151 IEEE P269/D25 October 2004 5697 5698 5699 5700 5701 5702 5703 5704 5705 After a loudness balance has been attained by the subject, the loudness difference between the test and reference headset receivers is represented by the difference in the voltage levels at TPI and TP2. The loudness difference is also represented by the difference between the sum of the dB losses of Attenuator 2 and 3 and the dB gain of Amplifier 3. For example, assume an amplifier gain of 15 dB and a total loss of 16 dB for Attenuator 2 and 3. The loudness difference would be 16 –15 = 1 dB, the test receiver is 1 dB louder than the reference receiver. The gain of Amplifier 3 should be determined in pre-tests with the test and reference headsets so that the combination of gain in Amplifier 3 and loss in Attenuator 2 and 3 provide a-maximum range of adjustment on either side of the estimated loudness balance point. 5706 U.4 Estimate of test headset receive characteristics 5707 5708 5709 5710 5711 5712 5713 5714 5715 5716 5717 5718 5719 5720 5721 5722 5723 To estimate the receive characteristics of the test headset, the receive characteristics of the reference headset shall first be objectively measured. The measurement bands are the same as specified for the loudness balance procedure: 315 Hz, 500 Hz, 800 Hz, 1250 Hz, 2000 Hz, and 3150 Hz. The desired results from the objective measurements are the receiver output pressures, in dB SPL, at the six test frequencies. The loudness difference between the test and reference receivers, at each of the test frequencies, is calculated by averaging the 40 loudness differences (2 repetitions/2 ears/10 subjects) obtained at each test frequency. The estimated output pressure for the test headset at each test frequency (assuming the same input voltage as had been used to objectively measure the reference receiver) is calculated by: TREP = RROP + LD where TREP RROP LD is the test receiver estimated pressure in dB Pa is the reference receiver objective pressure in dB Pa is the loudness difference between test and reference receivers in dB Copyright © 2004 IEEE. All rights reserved. This is an unapproved IEEE Standards Draft, subject to change. 152
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