PXI-4462

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Requirements and Compatibility

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Ordering Information

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Detailed Specifications

For user manuals and dimensional drawings, visit the product page resources tab on ni.com.

Last Revised: 2014-11-06 07:13:49.0

24-Bit, 204.8 kS/s Dynamic Signal Acquisition and Generation

NI 4461, NI 4462

2 or 4 simultaneously sampled analog inputs

2 simultaneously updated analog outputs (NI 4461 only)

118 dB dynamic range, 24-bit resolution

204.8 kS/s maximum sampling rate

92 kHz alias-free bandwidth

Input range from ±316 mV to 42.4 V

6 gain settings

AC/DC coupling

Antialiasing and anti-imaging protection

IEPE conditioning – software-configurable

Multimodule synchronization

Overview

The National Instruments 4461 and 4462 are high-accuracy data acquisition devices specifically designed for sound and vibration applications. The devices include the hardware and software needed to make precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. Common applications for the NI 446x include audio test, automotive test, noise, vibration, and harshness (NVH) analysis, and machine condition monitoring (MCM). The NI 446x devices offer a complete range of functionality for sound and vibration monitoring and analysis applications. With either two inputs and two outputs, or four inputs, they are ideal for applications where simultaneous generation and acquisition of noise, vibration, and acoustic signals are required. You can synchronize the acquisition clock of your NI 446x with other instruments in your system for mixed-signal applications. Both analog and digital triggering are available on an NI 446x.

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Requirements and Compatibility

OS Information

Windows 2000/XP

Windows 7

Windows NT

Windows Vista

Driver Information

NI-DAQmx

Software Compatibility

LabVIEW

LabWindows/CVI

Measurement Studio

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Comparison Tables

Product Bus

Analog

Inputs

NI 4461

PXI,

PCI

NI 4462

PXI,

PCI

2

4

Input

Resolution

24 bits

24 bits

Sampling

Rate

Input Range Input Configuration

204.8 kS/s

204.8 kS/s

±316 mV to 42.4

V

Differential/pseudodifferential 2

±316 mV to 42.4

V

Differential/pseudodifferential 0

Analog

Output

Output

Resolution

24 bits

-

Update

Rate

204.8 kS/s

-

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Application and Technology

Hardware

Applications

Audio Test

Noise, Vibration, and Harshness Test

Machine Condition Monitoring

Sound Power

Structural Vibration

Pass-by Noise

Analog Inputs

The analog input channels of NI 446x devices have 24-bit resolution ADCs that are simultaneously sampled at software-programmable rates for standard audio applications, such as 44.1 kS/s (the standard rate used in CD players), 48.0 kS/s (the rate used in digital audio tape (DAT) recorders and other digital audio equipment), 96.0 kS/s, and 192 kS/s. An

NI 446x is well-suited for audio, sound, and vibration analysis applications.

The analog inputs offer programmable AC/DC coupling. A programmable gain amplifier stage on the inputs gives gain selection from -20 to +30 dB in 10 dB steps. Furthermore, to provide you with the quietest and highest-quality analog measurements, the input stage accepts differential or single-ended signal connections.

With 118 dB dynamic range and low noise and distortion, NI 446x devices can make very accurate frequency-domain measurements. They have excellent amplitude flatness of

±0.1 dB within the frequency range of DC to 92 kHz, and have a typical THD of -107 dB.

Figure 1. These 24-bit delta-sigma converters deliver outstanding dynamic range.

Antialiasing

The analog inputs have both analog and digital filters implemented in hardware to prevent aliasing. Input signals are first passed through a fixed analog filter to remove any signals with frequency components beyond the range of the ADCs. Then digital antialiasing filters automatically adjust their cutoff frequency to remove any frequency components above half the programmed sampling rate.

Analog Outputs

NI 4461 devices have two channels of 24-bit resolution, high-fidelity analog output. A common application of the analog output is to stimulate a system under test while measuring the frequency response with the analog inputs. The output conversions occur simultaneously at softwareprogrammable rates up to 204.8 kS/s. The analog output circuitry uses

8-times oversampling interpolators with 64-times oversampling delta-sigma modulators to offer exceptional spectral purity. Software-programmable attenuation of 0, 20, or 40 dB is available on the output channels. NI 4461 devices have excellent amplitude flatness of ±0.1 dB within DC to 92 kHz, and a THD of -95 dB at 1 kHz. You can simultaneously acquire data on the input channels while updating the output channels.

Anti-Imaging

NI 4461 output channels have both analog and digital anti-imaging filters. These filters remove the unwanted out-of-band components generated when an analog signal is produced from digital data. The digital filters limit the bandwidth of the output signal to half the original conversion rate, thereby rejecting images caused by the 8-times oversampling process. The signals generated by the analog output circuitry are low-distortion, low-noise, flat-frequency analog signals.

Multimodule Synchronization

For applications requiring more channels, you can synchronize the operation of two or more NI 446x devices with less than 0.1 deg phase mismatch. Synchronization is achieved by sharing a digital trigger and clock between multiple modules. The NI-DAQmx driver software automatically handles the synchronization of multiple devices in a single task.

Triggering

NI 446x devices offer both analog and digital triggering for signal acquisition. The source of the trigger can come from any analog input channel, the external digital trigger input, the PXI trigger bus (PXI devices), or the RTSI bus (PCI devices). The external digital trigger is 5 VTTL/CMOS-compatible and is activated by a choice of rising or falling edge.

Triggering is needed in applications that acquire transient signals. When performing structural analysis by striking a metal beam with a hammer, for instance, you measure transient vibrations with accelerometers with acquisition triggered by the hammer impact.

Calibration

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National Instruments calibrates the offset voltage and gain accuracy of the analog inputs and outputs. An onboard precision voltage reference ensures that the gain and offset remain stable and accurate. NIST-traceable and ISO 9002-certified calibration certificates are available on request.

Figure 2. With application software such as NI LabVIEW, you can conduct frequency-response, swept-sine, and other common audio measurements.

Software

NI Measurement Services Software

NI 446x devices use NI measurement services software, based on the NI-DAQmx driver, as the hardware and OS interface. You can build automated test systems or integrate an

NI 446x with other hardware, including modular instruments and multifunction data acquisition (DAQ) products, through NI-DAQmx function calls. NI measurement services software also includes DAQ Assistant, an interactive guide that steps you through configuring, testing, and programming measurement tasks and generates the necessary code automatically for National Instruments LabVIEW, LabWindows/CVI, or Measurement Studio.

Analysis Software

LabVIEW Sound and Vibration Toolkit

NI 446x devices are well-suited for audio, acoustic, and vibration analysis applications. The LabVIEW Sound and Vibration Toolkit incorporates Express technology to make it easier for you to perform sound and vibration measurement and analysis. The toolkit includes LabVIEW Express VIs for:

Fractional-octave analysis with weighting

Integrated vibration level

Weighted sound level

Zoom power spectrum

Peak search

Power in band

Power spectrum analysis

Frequency response

Limit testing

In addition, the LabVIEW Sound and Vibration Toolkit includes numerous VIs for audio measurements such as gain, phase, distortion, and swept-sine analysis. Swept-sine is a powerful analysis technique to measure frequency response. The toolkit also includes simple modular examples of all of these measurements, so you can quickly combine analog output, analog input, and data analysis to build a customized application. In addition, the existing signal generation is extended to include the tools and examples needed to provide the excitation required by most audio, noise, and vibration measurements. For example, a library of 33 waveforms is included in this toolkit to get you up and running fast.

This toolkit also optimizes LabVIEW to perform noise and vibration measurements. For example, all frequency measurements can perform zoom FFT analysis to offer improved resolution in the frequency range of interest. With the built-in fractional-octave analysis, you can perform measurements with any number of bands at any sampling frequency. NI

446x dynamic signal acquisition devices, combined with this toolkit, offer compliance with several standards for sound level measurements and octave analysis:

IEC 61260 : 1995, class 1

IEC 61672 : 2002, class 1

ANSI S1.11 – 2004, class 1

ANSI S1.4 – 1983

ANSI S1.42 – 1986

LabVIEW Order Analysis Toolkit

Order analysis is a tool for examining dynamic signals generated by mechanical systems that include rotating or reciprocating components. With order analysis you can dissect sound, vibration, and other dynamic signals into components that relate to physical elements of mechanical systems.

The LabVIEW Order Analysis Toolkit is ideal for machine monitoring, machine health, and machine efficiency applications. You can use the toolkit to perform the most common analyses required by MCM applications, including order tracking, slow-roll compensation, and vibration integration. With this toolkit, you can develop your application faster by using built-in examples for order spectra, tachometer processing, and waterfall plots.

You can also apply order analysis to dynamic signals generated by mechanical systems that include rotating or reciprocating components, such as turbines, compressors, pumps, and engines. It is common to use order analysis in applications such as machine condition monitoring and noise, vibration, and harshness (NVH) testing. With the added capability for online processing, you can easily create flexible applications for condition-based monitoring and predictive maintenance. The National Instruments 446x dynamic signal acquisition devices are ideal for acquiring sound and vibration signals to analyze with this toolkit.

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Ordering Information

For a complete list of accessories, visit the product page on ni.com.

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Software Recommendations

NI LabVIEW Full Development

System for Windows

Fully integrated graphical system design software

Support for a wide range of measurement hardware, I/O, and buses

Custom, event-driven user interfaces for measurement and control

Extensive signal processing, analysis, and math functionality

Advanced compiler to ensure high-performance execution and code optimization

Includes SSP for professional technical support, online training, and software upgrades

NI LabVIEW Real-Time

Module

NI Sound and Vibration

Toolkit

Stand-alone configuration-based analysis and data logging with the Sound and Vibration

Assistant

AES17-compliant audio filter signal processing

Easy-to-use power spectrum, swept sine, and octave analysis steps

Sound level with A-, B-, or C-weighting and vibration level with integration

Audio measurements including THD, SNR,

SINAD, and swept-sine analysis

Universal File Format (UFF58) file I/O support

Design deterministic real-time applications with LabVIEW graphical programming

Download to dedicated NI or third-party hardware for reliable execution and a wide selection of I/O

Take advantage of built-in PID control, signal processing, and analysis functions

Automatically take advantage of multicore

CPUs or set processor affinity manually

Includes real-time OS, development and debugging support, and board support

Purchase individually or as part of a

LabVIEW suite

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Support and Services

System Assurance Programs

NI system assurance programs are designed to make it even easier for you to own an NI system. These programs include configuration and deployment services for your NI PXI,

CompactRIO, or Compact FieldPoint system. The NI Basic System Assurance Program provides a simple integration test and ensures that your system is delivered completely assembled in one box. When you configure your system with the NI Standard System Assurance Program, you can select from available NI system driver sets and application development environments to create customized, reorderable software configurations. Your system arrives fully assembled and tested in one box with your software preinstalled.

When you order your system with the standard program, you also receive system-specific documentation including a bill of materials, an integration test report, a recommended maintenance plan, and frequently asked question documents. Finally, the standard program reduces the total cost of owning an NI system by providing three years of warranty coverage and calibration service. Use the online product advisors at ni.com/advisor to find a system assurance program to meet your needs.

Calibration

NI measurement hardware is calibrated to ensure measurement accuracy and verify that the device meets its published specifications. To ensure the ongoing accuracy of your measurement hardware, NI offers basic or detailed recalibration service that provides ongoing ISO 9001 audit compliance and confidence in your measurements. To learn more about NI calibration services or to locate a qualified service center near you, contact your local sales office or visit ni.com/calibration.

Technical Support

Get answers to your technical questions using the following National Instruments resources.

Support - Visit ni.com/support to access the NI KnowledgeBase, example programs, and tutorials or to contact our applications engineers who are located in NI sales offices around the world and speak the local language.

Discussion Forums - Visit forums.ni.com for a diverse set of discussion boards on topics you care about.

Online Community - Visit community.ni.com to find, contribute, or collaborate on customer-contributed technical content with users like you.

Repair

While you may never need your hardware repaired, NI understands that unexpected events may lead to necessary repairs. NI offers repair services performed by highly trained technicians who quickly return your device with the guarantee that it will perform to factory specifications. For more information, visit ni.com/repair.

Training and Certifications

The NI training and certification program delivers the fastest, most certain route to increased proficiency and productivity using NI software and hardware. Training builds the skills to more efficiently develop robust, maintainable applications, while certification validates your knowledge and ability.

Classroom training in cities worldwide - the most comprehensive hands-on training taught by engineers.

On-site training at your facility - an excellent option to train multiple employees at the same time.

Online instructor-led training - lower-cost, remote training if classroom or on-site courses are not possible.

Course kits - lowest-cost, self-paced training that you can use as reference guides.

Training memberships and training credits - to buy now and schedule training later.

Visit ni.com/training for more information.

Extended Warranty

NI offers options for extending the standard product warranty to meet the life-cycle requirements of your project. In addition, because NI understands that your requirements may change, the extended warranty is flexible in length and easily renewed. For more information, visit ni.com/warranty.

OEM

NI offers design-in consulting and product integration assistance if you need NI products for OEM applications. For information about special pricing and services for OEM customers, visit ni.com/oem.

Alliance

Our Professional Services Team is comprised of NI applications engineers, NI Consulting Services, and a worldwide National Instruments Alliance Partner program of more than

700 independent consultants and integrators. Services range from start-up assistance to turnkey system integration. Visit ni.com/alliance.

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Detailed Specifications

year from the time of the device external calibration. All specifications are subject to change without notice. Visit

ni.com/manuals

for the most current specifications and product documentation.

Caution The inputs of this sensitive test and measurement product are not protected for electromagnetic interference for functional reasons. As a result, this product may experience reduced measurement accuracy or other temporary performance degradation when cables are attached in an environment with electromagnetic interference present. Refer to the Declaration of Conformity (DoC) for this product for details of the standards applied to assess electromagnetic compatibility performance. To obtain the DoC, visit

ni.com/certification

, search by model number or product line, and click the appropriate link in the Certification column.

Analog Input

This section lists the NI 446x analog input (AI) specifications.

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Input Characteristics

Number of simultaneously sampled input channels

NI 4461

NI 4462

Input configuration

Input coupling

A/D converter (ADC) resolution

ADC type

ADC modulator oversample rate

Sample Clock Timebase Rate

FIFO buffer size

Data transfers

Input Common Mode Range

Input Overvoltage Protection

Differential configuration

Pseudodifferential configuration

Positive terminal

Negative terminal (shield)

Input Signal Range

2

4

Differential or pseudodifferential (50 Ω between negative input and chassis ground), each channel independently software selectable

AC or DC, each channel independently software selectable

24 bits

Delta-sigma

1 kS/s to 204.8 kS/s in 181.9 μS/s increments, maximum

128 ƒ s

64 ƒ s

32 ƒ s

Sample Clock Timebase Rate

Low-Frequency Alias Rejection Enabled (Default) Low-Frequency Alias Rejection Disabled

512 ƒ s

16,384 ƒ s

8,192 ƒ s

4,096 ƒ s

2,048 ƒ s

1,024 ƒ s

512 ƒ s

256 ƒ s

128 ƒ s

256 ƒ

128 ƒ s s

2,047 samples

Direct memory access (DMA)

Gain (dB) Input Differential

*

Pseudodifferential

*

≥0 + ±12 V pk

±12 V pk

<0

–

+

±12 V pk

±42.4 V pk

±10 V pk

±42.4 V pk

– ±42.4 V pk

±10 V pk

*

Voltages with respect to chassis ground

±42.4 Vpk

±42.4 Vpk

±10.0 Vpk

30

Gain (dB)

±0.316

Full-Scale Range (V pk

)

*

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Gain (dB)


)

*

20

10

±1.00

±3.16

0

–10

±10.0

±31.6

–20 ±42.4

*

Each input channel gain is independently software selectable.

Transfer Characteristics

AI Offset (Residual DC)

Gain (dB) DC-Coupled Offset

*, †

, Max, T cal

±

30 0.1

20

10

0

–10

–20

0.2

0.5

0.7

5

7

±

1

2

3

7

30

70

*

Source impedance ≤ 50 Ω.

†

Listed offset is valid 24 hours following a self calibration.

‡

T

cal

= ambient temperature at which last self calibration was performed.

AI Gain Amplitude Accuracy

1 kHz input tone

T cal

±5 °C

(T cal

= ambient temperature at which last self calibration was performed.)

±0.03 dB max

(Listed accuracy is valid 24 hours following a self calibration.)

Over operating temperature range

Amplifier Characteristics

Input Impedance

±0.2 dB max

Input Impedance Differential Configuration Pseudodifferential Configuration

Between positive input and chassis ground 1 M Ω || 217 pF

Between negative input and chassis ground 1 M Ω || 229 pF

1 M Ω || 217 pF

50 Ω

Common-Mode Rejection Ratio (CMRR)

Gain (dB) DC-Coupled CMRR (dBc)

*, †

AC-Coupled CMRR (dBc)

†, ‡

70 30

20

105

101

10

0

90

80

–20, –10 60 65

*

≤ 1 kHz

†

Differential configuration

‡

50 or 60 Hz

Dynamic Characteristics

1

Specification Low-Frequency Alias Rejection Enabled (Default)

Alias-free bandwidth (BW) (passband) DC to 0.4 ƒ s

Alias rejection, minimum 104 dBc

DC to 0.4535 ƒ s

120 dBc

Low-Frequency Alias Rejection Disabled

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Specification

Alias rejection by frequency

Low-Frequency Alias Rejection Enabled (Default)

Input frequency > 0.6 ƒ s

–3 dB BW 0.484 ƒ s

AC coupling

–3 dB cutoff frequency

–0.1 dB cutoff frequency

Magnitude Response of AC Coupling Circuit (1 Hz to 1 kHz)

0.491 ƒ s

3.4 Hz

22.6 Hz

Low-Frequency Alias Rejection Disabled

Phase Response of AC Coupling Circuit (1 Hz to 1 kHz)

ADC Filter Delay

AI Flatness

Low-Frequency Alias Rejection Enabled (Default) Low-Frequency Alias Rejection Disabled

Sample Rate (kS/s) Filter Delay (Samples) Sample Rate (kS/s) Filter Delay (Samples)

32.96875

63

33.9375

35.875

39.75

47.5

63

Gain (dB)

20 Hz to 20 kHz 20 Hz to 45 kHz 20 Hz to 92.2 kHz

0, 10, 20, 30 ±0.006 (±0.003) ±0.03 (±0.02)

–20, –10 ±0.2 (±0.1) ±0.6 (±0.33)

±0.1 (±0.08)

±1 (±0.55)

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AI Spectral Noise Density

AI spectral noise density (with EAR turned on)

AI Spectral Noise Density (30 dB Gain)

Gain (dB)

20 Hz to 20 kHz 20 Hz to 45 kHz 20 Hz to 92.2 kHz

*

Relative to 1 kHz

8 nV/ at 30 dB gain, 1 kHz

AI Idle Channel Noise

Sample Rate (kS/s)

Idle Channel Noise

*, † dBV rms

μV rms

–118 dBV rms

1.3 μV rms

–115 dBV rms

1.8 μV rms

–111 dBV rms

2.8 μV rms

*

Source impedance ≤ 50 Ω

†

30 dB gain

AI Spurious Free Dynamic Range (SFDR)

30

0, 10, 20

–20, –10

Gain Setting (dB)

*

ƒ = 204.8 kS/s

†

‡

Measurement includes all harmonics.

106

108

110

SFDR (dBc)

*, †, ‡

SFDR 51.2 kS/s (–1 dBFS, 0 dB Gain, 1 kHz Sine Wave Input)

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AI Dynamic Range


30

20

103 (105)

111 (113)

100 (102)

108 (110)

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96 (98)

104 (106)

www.ni.com


10 114 (117) 111 (114)

0

–10

116 (118)

107 (108)

113 (114)

104 (105)

–20 105 (107)

*

1 kHz input tone, –60 dBFS input amplitude

102 (104)

AI Total Harmonic Distortion (THD), Balanced Source

106 (110)

107 (110)

101 (102)

98 (101)

Gain (dB)

30

THD (dBc)

*, †

20 Hz to 20 kHz

–100

20 Hz to 92.2 kHz

–97

20

0, 10

–10

–20

–109

–107

–108

–107

–106

–104

–107

–106

*

ƒ = 204.8 kS/s, 92.8 kHz BW, differential configuration

†

Input amplitude is the lesser of –1 dBFS or 8.91 V .

AI THD, Unbalanced Source

20

10

0

–10

–20

Gain (dB)

30

THD (dBc)

*, †

20 Hz to 20 kHz 20 Hz to 92.2 kHz

–100 –93

–106

–105

–97

–90

–91

–94

–92

–87

–88

–89

*

ƒ = 204.8 kS/s, 92.8 kHz BW

†


AI THD (Balanced Source with Differential Configuration, 204.8 kS/s, 0 dB Gain)

AI THD Plus Noise (THD+N), Balanced Source

20

10

0

Gain (dB)

30

THD+N (dBc)

*

51.2 kS/s, 20 Hz to 20 kHz

†

204.8 kS/s, 20 Hz to 92.2 kHz

‡

–103 –94

–107

–108

–107

–95

–96

–96

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Gain (dB)

–10

THD+N (dBc)

*

51.2 kS/s, 20 Hz to 20 kHz

†

–96

204.8 kS/s, 20 Hz to 92.2 kHz

–91

‡

–20 –94 –88

*

Input amplitude is the lesser of –1 dBFS or 8.91 V , differential configuration.

†

23.2 kHz measurement BW

‡


AI THD+N, Unbalanced Source

10

0

–10

–20

Gain (dB)

THD+N (dBc)

*

51.2 kS/s, 20 Hz to 20 kHz

†

204.8 kS/s, 20 Hz to 92.2 kHz

‡

30

20

–103

–107

–91

–93

–108

–104

–94

–93

–91

–87

–86

–86

*


†


‡


AI Intermodulation Distortion (IMD)

Crosstalk, Input Channel Separation

Gain (dB)

IMD (dBc)

*

20, 30

10

0

–109

–107

–104

–20, –10 –111

*

CCIF 14 kHz + 15 kHz, each tone amplitude is the lesser of –6 dBFS or 5 V .

Gain (dB) Crosstalk for Adjacent (Nonadjacent) Channels (dBc)

*, †

1 kHz Signal 92.2 kHz

30 –130 (–140)

0, 10, 20 –138 (–145)

–20, –10 –96 (–124)

–110 (–124)

–110 (–124)

–60 (–108)

*


†

AI Interchannel Gain Mismatch

Gain (dB)

DC-Coupled Mismatch (dB)

*

20 Hz to 20 kHz 20 Hz to 92.2 kHz

AC-Coupled Mismatch (dB)

*

20 Hz

0.004

30 0.004

0, 10, 20 0.003

0.008

0.003

–20, –10 0.04

0.25

*

Identical channel configurations

0.006

AI Interchannel Phase Mismatch

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Gain (dB)

DC-Coupled Mismatch (deg)

*

20 Hz to 20 kHz 20 Hz to 92.2 kHz

AC-Coupled Mismatch (deg)

*

20 Hz

30

20

0.10

0.04

0.60

0.15

0.08

0, 10 0.015

–20, –10 0.7

0.08

1

*

Identical channel configurations

AI Phase Linearity

Gain (dB) Linearity (deg)

20 Hz to 20 kHz 20 Hz to 92.2 kHz

0, 10, 20, 30 ±0.01

–20, –10 ±0.10

±0.03

±1

Onboard Calibration Reference

DC level

5.000 V ±2.5 mV

Temperature coefficient

±5 ppm/°C max

Long-term stability

Integrated Electronic Piezoelectric (IEPE)

Current

±15 ppm/

0 mA, 4 mA ±15%, or 10 mA ±15%, each channel independently software selectable

24 V min

Compliance

Note Use the following equation to make sure that your configuration meets the IEPE compliance voltage range.

V

common-mode

V

bias

V

full-scale

must be 0 to 24 V, where

common-mode

is the common-mode voltage seen by the input channel,

V

bias

is the DC bias voltage of the sensor, and

V

full-scale

is the AC full-scale voltage of the sensor.

Channel input impedance with IEPE enabled

Current noise

(1 MΩ || 240 pF), pseudodifferential

<300 pA/

Transducer Electronic Data Sheet (TEDS) Support

The PCI-4461, PCI-4462, PXI-4461 (revision M or later), and PXI-4462 inputs support Transducer Electronic Data Sheet (TEDS) according to the IEEE 1451 Standard. For more information about TEDS, go to

ni.com/info

and enter the info code rdteds .

Analog Output (NI 4461 Only)

This section lists the NI 4461 analog output (AO) specifications.

Output Characteristics

Number of output channels

Output configuration

DAC resolution

DAC type

2, simultaneously sampled

Differential or pseudodifferential (50 Ω to chassis ground on shield), each channel independently software selectable

24 bits

Delta-sigma

1 kS/s to 204.8 kS/s in 181.9 μS/s increments, maximum

DAC modulator oversample rate

8,192 ƒ s

4,096 ƒ s

2,048 ƒ s

1,024 ƒ s

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512 ƒ s

256 ƒ s

128 ƒ s

64 ƒ s

1,023 samples

DMA

FIFO buffer size

Data transfers

Output Signal Range

Attenuation (dB)


)

*

40

20

±0.1

±1.0

0 ±10.0

*

Each output channel range is independently software selectable.

Transfer Characteristics

AO Offset (Residual DC)

20, 40

0

1

1

2

10

*

Listed offset is valid 24 hours following a self calibration.

†

T

cal

= ambient temperature at which last self calibration was performed.

Gain (Amplitude Accuracy)

Specifications valid at any attenuation setting with a 1 kHz output signal.

T cal

±5 °C

(T cal

= ambient temperature at which last self calibration was performed.)

(Listed accuracy is valid 24 hours following a self calibration.)

Over operating temperature range

Voltage Output

Output coupling

Short circuit protection

Minimum working load

Output Impedance

±0.04 dB max

±0.1 dB max

DC

Indefinite protection between positive and negative

600 Ω

Output Impedance

Between positive output and chassis ground 2.4 kΩ

Between negative output and chassis ground 2.4 kΩ

Between positive and negative outputs

Differential Configuration Pseudodifferential Configuration

22 Ω

70 Ω

50 Ω

22 Ω

Dynamic Characteristics

1

Image rejection

–3 dB BW

DAC filter delay (samples), for update rate

75 dB min < 768 kHz, 66 dB min > 768 kHz

0.487 ƒ s

36.6

36.8

37.4

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38.5

40.8

43.2

48.0

32.0

AO Flatness

All attenuation settings relative to 1 kHz

20 Hz to 20 kHz

20 Hz to 92.1 kHz

AO Idle Channel Noise

±0.008 dB max

±0.1 dB max

Attenuation (dB) Maximum Idle Channel Noise

102.5 kS/s (30 kHz BW)

*

204.8 kS/s (80 kHz BW)

*

204.8 kS/s (500 kHz BW)

* dB V rms

μ V rms

μ V rms

40

20

–106

–106

0 –96

*

Noise equivalent bandwidth

5

5

16

dB V rms

–101

–101

–93

9

9

23

dB V rms

–87

–86

–73

45

50

μ V rms

224

AO Spurious Free Dynamic Range (SFDR)


SFDR (dBc)

*, †, ‡

40

20

0

87

94

98

*

ƒ = 204.8 kS/s

†

1 kHz output frequency, –1 dBFS output amplitude

‡

Measurement includes all harmonics.

AO Dynamic Range


40

Minimum Dynamic Range (dBFS)

*

102.5 kS/s (30 kHz BW)

†

204.8 kS/s (80 kHz BW)

†

204.8 kS/s (500 kHz BW)

†

83 78 64

20

0

103

113

98

110

83

90

*

1 kHz output frequency, –60 dBFS output amplitude

†

Noise equivalent bandwidth

AO THD


THD (dBc)

*

102.5 kS/s, 20 Hz to 20 kHz

†

204.8 kS/s, 20 Hz to 20 kHz

‡

204.8 kS/s, 20 Hz to 92.1 kHz

‡

40

20

0

–99

–98

–97

–92

–95

–94

–92

–93

–83

*

–1 dBFS output amplitude

†

30 kHz measurement BW

‡


15/19 www.ni.com

AO THD (204.8 kS/s, 0 dB Gain, 65,536 Samples, 92.8 kHz Measurement BW)

AO THD+N


40

THD+N (dBc)

*

102.5 kS/s, 20 Hz to 20 kHz

†

204.8 kS/s, 20 Hz to 80 kHz

‡

204.8 kS/s, 20 Hz to 92.1 kHz

**

–83 –76 –63

20

0

–98

–97

–92

–86

–79

–68

*

–1 dBFS output amplitude

†


‡


**


AO Intermodulation Distortion (IMD)


IMD (dBc)

*

40 –99

20

0

–104

–104

*

CCIF 14 kHz + 15 kHz, each tone amplitude is –6 dBFS.

Crosstalk, Output to Input Channel Separation

Gain (dB)

30

20

10

0

–20, –10

Crosstalk (dBc)

*, †

1 kHz Signal 92.1 kHz

–151 –118

–150

–144

–137

–87

–118

–115

–111

–51

*


†

Output amplitude is the lesser of –1 dBFS or 8.91 V .

Crosstalk, Output Channel Separation

All attenuation settings (0, 20, and 40 dB)

1 kHz signal

92.1 kHz signal

AO Interchannel Gain Mismatch

All attenuation settings

20 Hz to 92.1 kHz

AO Interchannel Phase Mismatch

No measurable crosstalk

–110 dBc

0.03 dB

16/19 www.ni.com

All attenuation settings

20 Hz to 20 kHz

20 Hz to 92.1 kHz

0.1°

0.2°

AO Phase Linearity

Internal Frequency Timebase Characteristics

Accuracy

Aging

Triggers

Analog trigger

Purpose

Source

NI 4461

NI 4462

Level

Slope

Resolution

Hysteresis

Digital Trigger

Purpose

Source

Compatibility

Polarity

Minimum pulse width

General Specifications

This section lists general specification information for the NI 446x.

Bus Interface

PCI or PXI

DMA channels

NI 4461

NI 4462

Synchronization

PXI

CLK_10

PXI_STAR

PCI

Attenuation (dB) Linearity (deg)

20 Hz to 20 kHz 20 Hz to 92.1 kHz

0

20

40

±0.1

± 0.1

±0.1

±1.7

±1.6

±1.8

±20 ppm, over operating temperature range

8 ppm in first year; 5 ppm max/year after first year

Start trigger

AI0 or AI1

AI0, AI1, AI2, or AI3

Full scale, programmable

Positive (rising) or negative (falling), software selectable

24 bits

Programmable

Start or reference trigger

PFI0, PXI_Trig<0..6>

Transistor-transistor logic (5V TTL)

Rising or falling edge

10 ns

3.3 V or 5 V signal environment

2, analog input and analog output

1, analog input

Multiple, full chassis

Up to 14 devices per chassis

17/19 www.ni.com

RTSI

Power Requirements

Up to 3 devices across ribbon cable

Voltage NI PXI-4461 NI PCI-4461 NI PXI-4462 NI PCI-4462

+5 V 990 mA

+3.3 V 1,430 mA

+12 V 170 mA

–12 V 110 mA

2,200 mA

1,750 mA

40 mA

40 mA

990 mA

1,750 mA

130 mA

70 mA

1,900 mA

2,300 mA

100 mA

40 mA

Physical

Dimensions (not including connectors)

PCI

PXI

17.5 cm × 9.9 cm (6.9 in. × 3.9 in.) PCI slot

16 cm × 10 cm (6.3 in. × 3.9 in.) 3U CompactPCI slot

Analog I/O connectors

Digital trigger connector

BNC female

SMB male

Weight

PCI

226.8 g (8.0 oz)

PXI

Measurement Category

2

241 g (8.5 oz)

I

Caution Do

not x

Environmental

Operating Environment

Ambient temperature range

PXI-446x

0 to 55 °C (Tested in accordance with IEC-60068-2-1 and IEC-60068-2-2.)

PCI-446x

0 to 50 °C (Tested in accordance with IEC-60068-2-1 and IEC-60068-2-2.)

Relative humidity range

10 to 90%, noncondensing (Tested in accordance with IEC-60068-2-56.)

Altitude

2,000 m (at 25 °C ambient temperature)

Pollution Degree (indoor use only)

Storage Environment

2

Ambient temperature range

–20 to 70 °C (Tested in accordance with IEC-60068-2-1 and

IEC-60068-2-2.)

5 to 95%, noncondensing (Tested in accordance with IEC-60068-2-56.)

Relative humidity range

Shock and Vibration (PXI Only)

Operational shock

30 g peak, half-sine, 11 ms pulse (Tested in accordance with

IEC-60068-2-27. Test profile developed in accordance with

MIL-PRF-28800F.)

Random vibration

Operating

5 to 500 Hz, 0.3 g rms

Nonoperating

5 to 500 Hz, 2.4 g rms

(Tested in accordance with IEC-60068-2-64.

Nonoperating test profile exceeds the requirements of MIL-PRF-28800F,

Class 3.)

Safety Standards

This product is designed to meet the requirements of the following standards of safety for electrical equipment for measurement, control, and laboratory use:

IEC 61010-1, EN 61010-1

UL 61010-1, CSA 61010-1

Note For UL and other safety certifications, refer to the product label or the

Online Product Certification

section.

Electromagnetic Compatibility

This product meets the requirements of the following EMC standards for electrical equipment for measurement, control, and laboratory use:

EN 61326 (IEC 61326): Class A emissions; Basic immunity

EN 55011 (CISPR 11): Group 1, Class A emissions

18/19 www.ni.com

AS/NZS CISPR 11: Group 1, Class A emissions

FCC 47 CFR Part 15B: Class A emissions

ICES-001: Class A emissions

Note For the standards applied to assess the EMC of this product, refer to the

Online Product Certification

section.

Note For EMC compliance, operate this product according to the documentation.

CE Compliance

This product meets the essential requirements of applicable European Directives, as amended for CE marking, as follows:

2006/95/EC; Low-Voltage Directive (safety)

2004/108/EC; Electromagnetic Compatibility Directive (EMC)

Online Product Certification

Refer to the product Declaration of Conformity (DoC) for additional regulatory compliance information. To obtain product certifications and the DoC for this product, visit

ni.com/certification

, search by module number or product line, and click the appropriate link in the Certification column.

Environmental Management

National Instruments is committed to designing and manufacturing products in an environmentally responsible manner. NI recognizes that eliminating certain hazardous substances from our products is beneficial not only to the environment but also to NI customers.

For additional environmental information, refer to the

NI and the Environment

Web page at

ni.com/environment

. This page contains the environmental regulations and directives with which NI complies, as well as other environmental information not included in this document.

Waste Electrical and Electronic Equipment (WEEE)

EU Customers At the end of the product life cycle, all products

must

be sent to a WEEE recycling center. For more information about WEEE recycling centers, National

Instruments WEEE initiatives, and compliance with WEEE Directive 2002/96/EC on Waste Electrical and Electronic Equipment, visit

ni.com/environment/weee.htm

.

1

Test system equipped with an LCD monitor for AO noise and distortion measurements to avoid possible magnetic interference caused by CRT-based monitors.

2

Measurement Category

is also referred to as

Installation Category

.

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