Performance Tests
Agilent Technologies 8935 Series
E6380A CDMA Cellular/PCS Base Station
Test Set
Assembly Level Repair
Firmware Version B.03.10 and above
Agilent Part Number: E6380-90015
CD-ROM Part Number: E6380-90027
Revision E
Printed in UK
January 2001
Notice
Information contained in this document is subject to change without
notice.
All Rights Reserved. Reproduction, adaptation, or translation without
prior written permission is prohibited, except as allowed under the
copyright laws.
This material may be reproduced by or for the U.S. Government
pursuant to the Copyright License under the clause at DFARS
52.227-7013 (APR 1988).
© Copyright 1997 - 2001 Agilent Technologies
2
Contents
1. General Information
Manufacturer's Declaration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Safety Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SAFETY SYMBOLS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Safety Considerations for this Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Product Markings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Certification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Agilent Technolgies Warranty Statement for Commercial Products . . . . . . . . . . . . . . . . . . .
Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power Cables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Conventions Used in This Manual. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
What Is In This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Which Document is Required? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trademark Acknowledgements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
12
13
13
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20
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23
30
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2. Product Information
Instrument Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Instrument Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Upgrades. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Hardware and Firmware Enhancements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Load the Host Firmware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Load the DSP Firmware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA 2000 Enable Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Checking Firmware Version . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Repair Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lifting and Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Consumables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manuals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Service Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Factory Support. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Ordering Parts. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Repair and Calibration/
Instrument Support Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test & Measurement Call Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
46
46
3. Troubleshooting
How to Troubleshoot the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Self-Test Diagnostics (Step 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Start Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
If the Test Set Fails to Power-up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reading Front Panel or GPIB Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reading LED Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Functional Diagnostics (Step 2). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Accessing the Diagnostic Tests. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Define Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Configuring a Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Functional Diagnostics Menu. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
48
50
51
52
54
56
62
62
63
64
66
36
38
40
40
40
41
41
42
44
44
44
45
46
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3
Contents
AF, RF, & CDMA Diagnostics (Step 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68
AF Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68
RF Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
CDMA Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .72
Frequently Encountered Diagnostic Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
Warning/Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .74
Manual Troubleshooting Procedures (Step 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .75
Verify Test Set’s Reference Path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Out-of-Lock (OOL) LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
CDMA Generator Reference (A2A100) Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Reference, A2A23, Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .80
Receiver Synthesizer, A2A22, Unlocked . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .80
Signal Generator Synthesizer, A2A25, Unlocked . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .80
Swapping Known-Good Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81
Further Isolating RF Failures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .82
Isolating the RF Analyzer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .82
Isolating the RF Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84
Service Screen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86
How to Access the SERVICE Screen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86
Field Names and Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
Voltmeter Connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
Counter Connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
Gate Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
Latch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88
Value (hex) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89
RAM Initialize . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89
Product Verification. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .90
4. Preventative Maintenance
Hardware Maintenance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .94
Adjustments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .94
Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95
Functionality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95
Integrity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96
Maintenance Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
Cleaning the Air Filter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
Memory Backup AA Battery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
Reset and GFI-Test Buttons
(older units with GFI circuit). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .98
PC Card Battery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99
5. Disassembly
Service Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102
Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102
Recommended Torque . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102
Assembly Replacements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
Replacement Parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
4
Contents
Removing the External and Internal Covers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
External Covers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Internal Covers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Top Internal Covers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Bottom Internal Cover . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A1 Disassembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A2 Disassembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Module and PC Board Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A2A80A1 and A2A80A2 Filter Assembly Removal . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PCMCIA Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Control Interface Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Input/Output, Upconverter, & Downconverter Assemblies . . . . . . . . . . . . . . . . . . . . .
LO IF/IQ Modulator and CDMA Generator Reference (Gen Ref) Assemblies. . . . . . . . . .
Removing the LO IF/IQ Modulator Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Removing the Gen Ref Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
........................................................................
........................................................................
A3 Disassembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Removing the Power Supply Regulator Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Removing the Power Supply Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Power Supply Switch, Fan, & Battery Holder Assemblies . . . . . . . . . . . . . . . . . . . . . . . . .
Wire/Cable Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
104
104
105
105
108
110
112
112
115
116
117
118
120
120
120
122
124
126
127
127
129
130
6. Replaceable Parts
Replacement & Ordering Parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Direct Parts Ordering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Assembly Replacements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Parts Identification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Major Assembly Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Covers and Chassis Parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A1 Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A2 Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Module and PCB Board Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PCMCIA Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Attenuator Assembly. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Control Interface Assembly & Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF/IO, Up Converter, and Down Converter Assemblies . . . . . . . . . . . . . . . . . . . . . . . . .
LO IF/IQ MOD and GEN REF Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Motherboard and Sub Frame . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A3 Rear Panel Assembly. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Cable Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Parts List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
136
136
136
137
137
138
139
140
140
142
142
143
144
145
146
147
148
150
7. Periodic Adjustments
Periodic Adjustments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Equipment for the Periodic Adjustments Programs . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Equipment Needed for the System Power Calibration Program . . . . . . . . . . . . . . . . . .
158
160
160
161
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Contents
A Word About Storing Calibration Factors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .162
Running the Periodic, IQ, or Eb/No Calibration Programs . . . . . . . . . . . . . . . . . . . . . . . . . . .163
Running the System Power Calibration Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .164
Periodic Calibration Menu Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .165
Timebase Reference Using a Counter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .165
Timebase Reference Using a Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .166
Voltmeter References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .166
Audio Frequency Generator Gain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .167
External Modulation Path Gain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .168
Audio Analyzer 1 Offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .168
Variable Frequency Notch Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .168
Setting the Timebase Latches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .169
IQ Calibration Program Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .170
Eb/No Calibration Program Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .171
8. Performance Tests
Procedure and Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .174
How to Use the Performance Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .174
Test Set Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .174
Test Equipment and Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .174
RF Generator FM Distortion
Performance Test 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .178
Initial Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .178
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .179
RF Generator FM Accuracy
Performance Test 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .181
Initial Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .181
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .182
RF Generator FM Flatness
Performance Test 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .184
Initial Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .184
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .185
RF Generator Residual FM
Performance Test 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .187
Initial Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .187
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .188
RF Generator Level Accuracy
Performance Test 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .190
Procedure 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .190
Procedure 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .192
RF Generator Harmonics Spectral Purity
Performance Test 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .195
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .195
RF Generator Spurious Spectral Purity
Performance Test 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .196
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .196
AF Generator AC Level Accuracy
Performance Test 8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .197
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .197
6
Contents
AF Generator DC Level Accuracy
Performance Test 9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator Residual Distortion
Performance Test 10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator Frequency Accuracy
Performance Test 11. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer AC Level Accuracy
Performance Test 12. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Residual Noise
Performance Test 13. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer DC Level Accuracy
Performance Test 15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Oscilloscope Amplitude Accuracy
Performance Test 18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Level Accuracy
Performance Test 19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Accuracy
Performance Test 20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Distortion
Performance Test 21. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Bandwidth
Performance Test 22. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Residual FM
Performance Test 23. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Spectrum Analyzer Image Rejection
Performance Test 24. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Procedure 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
198
198
199
199
200
200
201
201
202
202
203
203
204
204
205
205
206
206
208
208
210
210
211
211
213
213
215
215
217
217
219
219
219
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Contents
Procedure 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .220
CDMA Generator Amplitude Level Accuracy
Performance Test 25 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .221
Setup 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .221
Procedure 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .221
CDMA Generator Modulation Accuracy
Performance Test 26 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .223
Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .223
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .223
CDMA Analyzer Average Power Level Accuracy
Performance Test 27 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .225
Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .225
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .225
CDMA Analyzer Channel Power Level Accuracy
Performance Test 28 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .227
Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .227
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .227
CDMA Analyzer Modulation Accuracy
Performance Test 29 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .229
Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .229
Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .229
9. Performance Test Records
RF Generator FM Distortion
Performance Test 1 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .234
RF Generator FM Accuracy
Performance Test 2 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .236
RF Generator FM Flatness
Performance Test 3 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .238
RF Generator Residual FM
Performance Test 4 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .240
RF Generator Level Accuracy
Performance Test 5 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .242
RF Generator Harmonics Spectral Purity
Performance Test 6 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .250
RF Generator Spurious Spectral Purity
Performance Test 7 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .254
AF Generator AC Level Accuracy
Performance Test 8 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .256
AF Generator DC Level Accuracy
Performance Test 9 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .258
AF Generator Residual Distortion
Performance Test 10 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .259
AF Generator Frequency Accuracy
Performance Test 11 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .261
AF Analyzer AC Level Accuracy
Performance Test 12 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .262
AF Analyzer Residual Noise
Performance Test 13 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .263
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Contents
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer DC Level Accuracy
Performance Test 15 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Oscilloscope Amplitude Accuracy
Performance Test 18 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Level Accuracy
Performance Test 19 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Accuracy
Performance Test 20 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Distortion
Performance Test 21 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Bandwidth
Performance Test 22 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Residual FM
Performance Test 23 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Spectrum Analyzer Image Rejection
Performance Test 24 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator Amplitude Level Accuracy
Performance Test 25 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator Modulation Accuracy
Performance Test 26 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Average Power Level Accuracy
Performance Test 27 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Channel Power Level Accuracy
Performance Test 28 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Modulation Accuracy
Performance Test 29 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10. Block Diagrams
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Input/Output Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Power Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Gain Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Frequency Conversion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Modulation Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Spectrum Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Audio Analyzer Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Level Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AC and DC Level Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Distortion and SINAD Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Oscilloscope Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
IF Conversion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
264
265
266
267
268
269
271
272
273
274
275
277
278
279
280
281
284
286
286
286
288
288
288
289
294
294
294
294
294
299
299
9
Contents
CDMA Signal Analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .299
Power Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .299
CDMA Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .302
Data Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .302
CDMA Reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .302
Audio Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .305
Waveform Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .305
Level Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .305
RF Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .308
Frequency Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .308
Level Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .309
Modulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .309
Reference/Regulator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .314
Reference. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .314
Power Supply Regulators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .314
Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .314
Instrument Control Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .317
Digital Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .317
Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .317
A. Error Messages
General Information About Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .322
Power-Up Self-Test Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .324
Diagnostics Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .325
Calibration Download Failure Error Message . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .326
Flash ROM Firmware Upgrade Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .327
Memory Card Checksum Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .327
Memory Card Read Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .327
Memory Erase Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .327
Memory Write Error. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .327
Programming Voltage Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .328
ROM Checksum Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .328
Self-Calibration Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .329
Text Only Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .330
Positive Numbered Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .331
IBASIC Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .332
GPIB Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .333
Non-Recoverable Firmware Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .334
If This Error Occurs at Power-Up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .334
10
1
General Information
This chapter contains generic information about the product, safety,
warranty, sales and service offices, power-cables, and other information.
11
General Information
Manufacturer's Declaration
Manufacturer's Declaration
This statement is provided to comply with the requirements of the
German Sound Emission Directive, from 18 January 1991.
This product has the following sound pressure emission specification:
• sound pressure Lp <70 dB(A)
• at the operator position
• under normal operation
• according to ISO 7779:1988/EN 27779:1991 (Type Test).
Herstellerbescheinigung
Diese Information steht im Zusammenhang mit den Anforderungen der
Maschinenlärminformationsverordnung vom 18 Januar 1991.
• Schalldruckpegel Lp < 70 dB(A).
• Am Arbeitsplatz.
• Normaler Betrieb.
• Nach ISO 7779:1988/EN 27779:1991 (Typprüfung).
12
Chapter 1
General Information
Safety Considerations
Safety Considerations
GENERAL
This product and related documentation must be reviewed for
familiarization with safety markings and instructions before operation.
This product has been designed and tested in accordance with IEC
Publication 61010-1+A1+A2:1992 Safety Requirements for Electrical
Equipment for Measurement, Control and Laboratory Use and has
been supplied in a safe condition. This instruction documentation
contains information and warnings which must be followed by the user
to ensure safe operation and to maintain the product in a safe condition.
SAFETY EARTH GROUND
A uninterruptible safety earth ground must be provided from the main
power source to the product input wiring terminals, power cord, or
supplied power cord set.
CHASSIS GROUND TERMINAL
To prevent a potential shock hazard, always connect the rear-panel
chassis ground terminal to earth ground when operating this
instrument from a dc power source.
SAFETY SYMBOLS
!
Indicates instrument damage can occur if indicated operating limits are
exceeded. Refer to the instructions in this guide.
Indicates hazardous voltages.
Indicates earth (ground) terminal
WARNING
A WARNING note denotes a hazard. It calls attention to a
procedure, practice, or the like, which, if not correctly
performed or adhered to, could result in personal injury. Do not
proceed beyond a WARNING sign until the indicated conditions
are fully understood and met.
CAUTION
A CAUTION note denotes a hazard. It calls attention to an operation
procedure, practice, or the like, which, if not correctly performed or
adhered to, could result in damage to or destruction of part or all of the
product. Do not proceed beyond an CAUTION note until the indicated
conditions are fully understood and met.
Chapter 1
13
General Information
Safety Considerations
Safety Considerations for this Instrument
WARNING
Whenever it is likely that the protection has been impaired, the
instrument must be made inoperative and be secured against
any unintended operation.
If this instrument is to be energized via an autotransformer (for
voltage reduction), make sure the common terminal is
connected to the earth terminal of the power source.
If this product is not used as specified, the protection provided
by the equipment could be impaired. This product must be used
in a normal condition (in which all means for protection are
intact) only.
No operator serviceable parts in this product. Refer servicing
to qualified personnel. To prevent electrical shock, do not
remove covers.
Servicing instructions are for use by qualified personnel only.
To avoid electrical shock, do not perform any servicing unless
you are qualified to do so.
The opening of covers or removal of parts is likely to expose
dangerous voltages. Disconnect the product from all voltage
sources while it is being opened.
Adjustments described in the manual are performed with
power supplied to the instrument while protective covers are
removed. Energy available at many points may, if contacted,
result in personal injury.
For Continued protection against fire hazard, replace the line
fuse(s) with T 250 V 5.0 A fuse(s) or the same current rating and
type. Do not use repaired fuses or short circuited fuseholders.
14
Chapter 1
General Information
Safety Considerations
WARNING
!
This product is a Safety Class I instrument (provided with a
protective earthing ground incorporated in the power cord).
The mains plug shall only be inserted in a socket outlet
provided with a protective earth contact. Any interruption of
the protective conductor inside or outside of the product is
likely to make the product dangerous. Intentional interruption
is prohibited.
Chapter 1
15
General Information
Safety Considerations
WARNING
Always use the three-prong ac power cord supplied with this
product. Failure to ensure adequate earth grounding by not
using this cord may cause personal injury and/or product
damage.
This product is designed for use in Installation Category II and
Pollution Degree 3 per IEC 61010 and IEC 60664 respectively.
This product has autoranging line voltage input, be sure the
supply voltage is within the specified range.
To prevent electrical shock, disconnect instrument from mains
(line) before cleaning. Use a dry cloth or one slightly dampened
with water to clean the external case parts. Do not attempt to
clean internally.
Ventilation Requirements: When installing the product in a
cabinet, the convection into and out of the product must not be
restricted. The ambient temperature (outside the cabinet) must
be less than the maximum operating temperature of the
product by 4° C for every 100 watts dissipated in the cabinet. If
the total power dissipated in the cabinet is greater than 800
watts, then forced convection must be used.
16
Chapter 1
General Information
Product Markings
Product Markings
The CE mark shows that the product complies with all
relevant European legal Directives (if accompanied by a
year, it signifies when the design was proven).
The CSA mark is a registered trademark of the
Canadian Standards Association.
Chapter 1
17
General Information
Certification
Certification
Agilent Technologies certifies that this product met its published
specifications at the time of shipment from the factory. Agilent further
certifies that its calibration measurements are traceable to the United
States National Institute of Standards and Technology, to the extent
allowed by the Institute’s calibration facility, and to the calibration
facilities of other International Standards Organization members.
18
Chapter 1
General Information
Certification
DECLARATION OF CONFORMITY
according to ISO/IEC Guide 22 and EN 45014
Manufacturer’s Name:
Agilent Technologies
Manufacturer’s Address:
Spokane Site
24001 E. Mission Avenue
Liberty Lake, Washington 99019-9599
USA
declares that the product
Product Name:
Model Number:
Product Options:
Agilent Technologies 8935 CDMA Cellular/PCS
Base Station Test Set
Agilent Technologies E6380A
All
conforms to the following Product specifications:
Safety:
IEC 1010-1:1990+A1 / EN 61010-1:1993
EMC:
CISPR 11:1990/EN 55011:1991- Group 1, Class A
IEC 1000-3-2:1995 / EN 61000-3-2: 1995
IEC 1000-3-2:1995 / EN 61000-3-3: 1994
EN 50082-1:1992
IEC 801-2:1991 4kV CD, 8kV AD
IEC 801-3:1984 3V/m
IEC 801-4:1988 0.5 kV Sig. Lines, 1 kV Power Lines
Supplementary Information:
This product herewith complies with the requirements of the Low Voltage Directive
73/23/EEC and the EMC Directive 89/336/EEC and carries the CE-marking accordingly.
Spokane, Washington USA
November 20,1998
Vince Roland
Reliability & Regulatory
Engineer
European Contact: Your local Agilent Technologies and Service Office or Agilent Technologies GmbH
Department ZQ/Standards Europe, Herrenberger Strasse 130, D-71034 Böblinger, Germany (FAX+49-7031-14-3143)
Chapter 1
19
General Information
Agilent Technolgies Warranty Statement for Commercial Products
Agilent Technolgies Warranty Statement for
Commercial Products
E6380A
CDMA/Cellular
PCS Base
Station Test Set
Duration of
1. Agilent warrants Agilent hardware, accessories and supplies against
Warranty: 1 Year
defects in materials and workmanship for the period specified above.
If Agilent receives notice of such defects during the warranty period,
Agilent will, at its option, either repair or replace products which
prove to be defective. Replacement products may be either new or
like-new.
2. Agilent warrants that Agilent software will not fail to execute its
programming instructions, for the period specified above, due to
defects in material and workmanship when properly installed and
used. If Agilent receives notice of such defects during the warranty
period, Agilent will replace software media which does not execute
its programming instructions due to such defects.
3. Agilent does not warrant that the operation of Agilent products will
be uninterrupted or error free. If Agilent is unable, within a
reasonable time, to repair or replace any product to a condition as
warranted, customer will be entitled to a refund of the purchase
price upon prompt return of the product.
4. Agilent products may contain remanufactured parts equivalent to
new in performance or may have been subject to incidental use.
5. The warranty period begins on the date of delivery or on the date of
installation if installed by Agilent. If customer schedules or delays
Agilent installation more than 30 days after delivery, warranty
begins on the 31st day from delivery.
6. Warranty does not apply to defects resulting from (a) improper or
inadequate maintenance or calibration, (b) software, interfacing,
parts or supplies not supplied by Agilent, (c) unauthorized
modification or misuse, (d) operation outside of the published
environmental specifications for the product, or (e) improper site
preparation or maintenance.
20
Chapter 1
General Information
Agilent Technolgies Warranty Statement for Commercial Products
7. TO THE EXTENT ALLOWED BY LOCAL LAW, THE ABOVE
WARRANTIES ARE EXCLUSIVE AND NO OTHER WARRANTY
OR CONDITION, WHETHER WRITTEN OR ORAL IS
EXPRESSED OR IMPLIED AND Agilent SPECIFICALLY
DISCLAIMS ANY IMPLIED WARRANTIES OR CONDITIONS OR
MERCHANTABILITY, SATISFACTORY QUALITY, AND FITNESS
FOR A PARTICULAR PURPOSE.
8. Agilent will be liable for damage to tangible property per incident up
to the greater of $300,000 or the actual amount paid for the product
that is the subject of the claim, and for damages for bodily injury or
death, to the extent that all such damages are determined by a court
of competent jurisdiction to have been directly caused by a defective
Agilent product.
9. TO THE EXTENT ALLOWED BY LOCAL LAW, THE REMEDIES
IN THIS WARRANTY STATEMENT ARE CUSTOMER’S SOLE
AND EXCLUSIVE REMEDIES. EXCEPT AS INDICATED ABOVE,
IN NO EVENT WILL Agilent OR ITS SUPPLIERS BE LIABLE
FOR LOSS OF DATA OR FOR DIRECT, SPECIAL, INCIDENTAL,
CONSEQUENTIAL (INCLUDING LOST PROFIT OR DATA), OR
OTHER DAMAGE, WHETHER BASED IN CONTRACT, TORT, OR
OTHERWISE.
FOR CONSUMER TRANSACTIONS IN AUSTRALIA AND NEW
ZEALAND: THE WARRANTY TERMS CONTAINED IN THIS
STATEMENT, EXCEPT TO THE EXTENT LAWFULLY
PERMITTED, DO NOT EXCLUDE RESTRICT OR MODIFY AND
ARE IN ADDITION TO THE MANDATORY STATUTORY RIGHTS
APPLICABLE TO THE SALE OF THIS PRODUCT TO YOU.
Chapter 1
21
General Information
Assistance
Assistance
Product maintenance agreements and other customer assistance
agreements are available for Agilent Technologies products. For any
assistance, contact your nearest Agilent Technologies Sales and Service
Office.
By internet, phone, or fax, get assistance with all your test and
measurement needs.
Table 1-1 Contacting Agilent
Online assistance: www.agilent.com/find/assist
United States
(tel) 1 800 452 4844
Latin America
(tel) (305) 269 7500
(fax) (305) 269 7599
Canada
(tel) 1 877 894 4414
(fax) (905) 282-6495
Europe
(tel) (+31) 20 547 2323
(fax) (+31) 20 547 2390
New Zealand
(tel) 0 800 738 378
(fax) (+64) 4 495 8950
Japan
(tel) (+81) 426 56 7832
(fax) (+81) 426 56 7840
Australia
(tel) 1 800 629 485
(fax) (+61) 3 9210 5947
Asia Call Center Numbers
Country
Phone Number
Fax Number
Singapore
1-800-375-8100
(65) 836-0252
Malaysia
1-800-828-848
1-800-801664
Philippines
(632) 8426802
1-800-16510170 (PLDT
Subscriber Only)
(632) 8426809
1-800-16510288 (PLDT
Subscriber Only)
Thailand
(088) 226-008 (outside Bangkok)
(662) 661-3999 (within Bangkok)
(66) 1-661-3714
Hong Kong
800-930-871
(852) 2506 9233
Taiwan
0800-047-866
(886) 2 25456723
People’s Republic
of China
800-810-0189 (preferred)
10800-650-0021
10800-650-0121
India
1-600-11-2929
000-800-650-1101
22
Chapter 1
General Information
Power Cables
Power Cables
Table 1-2
Power Cables
Plug Type
Earth Ground
Line
Plug Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
Straight/Straight
Straight/90°
8120-1689
8120-1692
79 inches, mint gray
79 inches, mint gray
Neutral
Used in the following locations
Afghanistan, Albania, Algeria, Angola, Armenia, Austria, Azerbaijan, Azores
Bangladesh, Belgium, Benin, Bolivia, Boznia-Herzegovina, Bulgaria, Burkina Faso,
Burma, Burundi, Byelarus
Cameroon, Canary Islands, Central AfricanRepublic, Chad, Chile, Comoros, Congo,
Croatia, Czech Republic, Czechoslovakia
Denmark, Djibouti
East Germany, Egypt, Estonia, Ethiopia
Finland, France, French Guiana, French Indian Ocean Areas
Gabon, Gaza Strip, Georgia, Germany, Gozo, Greece
Hungary
Iceland, Indonesia, Iran, Iraq, Israel, Italy, Ivory Coast
Jordan
Kazakhstan, Korea, Kyrgystan
Latvia, Lebanon, Libya, Lithuania, Luxembourg
Macedonia, Madeira Islands, Malagasy Republic, Mali, Malta, Mauritania, Miquelon,
Moldova, Mongolia, Morocco, Mozambique
Nepal, Netherlands, Netherlands Antilles, Niger, Norway
Oman
Pakistan, Paraguay, Poland, Portugal
Rep. South Africa, Romania, Russia, Rwanda
Saudi Arabia (220V), Senegal, Slovak Republic, Slovenia, Somalia, Spain, Spanish
Africa, Sri Lanka, St.Pierce Islands
Sweden, Syria
Chapter 1
23
General Information
Power Cables
Table 1-2
Power Cables
Plug Type
Earth Ground
Line
Plug Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
Straight/Straight
Straight/90°
8120-1689
8120-1692
79 inches, mint gray
79 inches, mint gray
Neutral
Tajikistan, Thailand, Togo, Tunisia, Turkey, Turkmenistan
USSR, Ukraine, Uzbekistan
Western Africa, Western Sahara
Yugoslavia
Zaire
Table 1-3
Power Cables
Plug Type
Plug
Descriptions
male/female
Agilent Part
#
(cable & plug)
Cable Descriptions
Straight/Straight
8120-0698
90 inches, black
Plug
Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
Straight/Straight
Straight/90°
8120-2104
8120-2296
79 inches, gray
79 inches, gray
Earth Ground
Line
Line
Used in the following locations
Peru
Table 1-4
Power Cables
Plug Type
Line
Neutral
Earth Ground
Used in the following locations
Switzerland
24
Chapter 1
General Information
Power Cables
Table 1-5
Power Cables
Plug Type
125V
Plug
Descriptions
male/female
Agilent Part
#
(cable &
plug)
Cable Descriptions
Straight/Straight
Straight/90
Straight/Straight
8120-1378
8120-1521
8120-1751
90 inches, jade gray
90 inches, jade gray
90 inches, jade gray
Earth Ground
Neutral
Line
Used in the following locations
American Samoa
Bahamas, Barbados, Belize, Bermuda, Brazil,
Caicos, Cambodia, Canada, Cayman Islands, Columbia, Costa Rica, Cuba
Dominican Republic
Ecuador, El Salvador
French West Indies
Guam, Guatemala, Guyana
Haiti, Honduras
Jamaica
Korea
Laos, Leeward and Windward Is., Liberia
Mexico, Midway Islands
Nicaragua
Other Pacific Islands
Panama, Philippines, Puerto Rico
Saudi Arabia (115V,127V), Suriname
Taiwan, Tobago, Trinidad, Trust Territories of Pacific Islands
Turks Island
United States
Venezuela, Vietnam, Virgin Islands of the US
Wake Island
Chapter 1
25
General Information
Power Cables
Table 1-6
Power Cables
Plug Type
JIS C 8303, 100 V
Plug
Descriptions
male/female
Agilent Part #
(cable & plug)
Cable
Descriptions
Straight/Straight
Straight/90°
8120-4753
8120-4754
90 inches, dark gray
90 inches, dark gray
Plug
Descriptions
male/female
Agilent Part #
(cable & plug)
Cable
Descriptions
90° /STRAIGHT
8120-2956
8120-2957
8120-3997
79 inches, gray
79 inches, gray
79 inches, gray
Earth Ground
Neutral
Line
Used in the following locations
Japan
Table 1-7
Power Cables
Plug Type
90°/90°
Straight/Straight
Earth Ground
Neutral
Line
Used in the following locations
Denmark
Greenland
Table 1-8
Power Cables
Plug Type
Plug Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
Straight/Straight
Straight/90°
8120-4211
8120-4600
79 inches, mint gray
79 inches, mint gray
Earth Ground
Line
Neutral
Used in the following locations
Botswana
India
26
Chapter 1
General Information
Power Cables
Table 1-8
Power Cables
Plug Type
Plug Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
Lesotho
Malawi
South-West Africa (Namibia), Swaziland
Zambia, Zimbabwe
Table 1-9
Power Cables
Plug Type (Male)
Earth Ground
Line
Plug
Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
90°/Straight
8120-1351
8120-1703
90 inches, mint gray
90 inches, mint gray
90°/90°
Neutral
Used in the following locations
Bahrain, British Indian Ocean Terr., Brunei
Canton, Cyprus
Enderbury Island, Equatorial Guinea
Falkland Islands, French Pacific Islands
Gambia, Ghana, Gibraltar, Guinea
Hong Kong
Ireland
Kenya, Kuwait
Macao, Malaysia, Mauritius
Nigeria
Qatar
Seychelles, Sierra Leone, Singapore, Southern Asia, Southern Pacific Islands, St. Helena,
Sudan
Tanzania
Uganda, United Arab Emirates, United Kingdom
Yeman (Aden & Sana)
Chapter 1
27
General Information
Power Cables
Table 1-10
Power Cables
Plug Type
Earth Ground
Plug
Descriptions
male/female
Agilent Part #
(cable & plug)
Cable
Descriptions
Straight/Straight
Straight/90°
8120-1369
8120-0696
79 inches, gray
80 inches, gray
Neutral
Line
Used in the following locations
Argentina, Australia
China (People’s Republic)
New Zealand
Papua New Guinea
Uruguay
Western Samoa
Table 1-11
Power Cables
Plug Type
Earth Ground
Line
Neutral
Plug
Descriptions
male/female
Agilent Part #
(cable & plug)
Cable Descriptions
Straight/Straight
Straight/Straight
Straight/90°
8120-1860
8120-1575
8120-2191
8120-4379
60 inches, jade gray
30 inches, jade gray
60 inches, jade gray
15.5 inches, jade gray
Straight/90°
Used in the following locations
System Cabinets
28
Chapter 1
General Information
Power Cables
ATTENTION
Static Sensitive
Devices
This instrument was constructed in an ESD (electro-static discharge) protected
environment. This is because most of the semiconductor devices used in this
instrument are susceptible to damage by static discharge.
Depending on the magnitude of the charge, device substrates can be punctured
or destroyed by contact or mere proximity of a static charge. The result can
cause degradation of device performance, early failure, or immediate
destruction.
These charges are generated in numerous ways such as simple contact,
separation of materials, and normal motions of persons working with static
sensitive devices.
When handling or servicing equipment containing static sensitive devices,
adequate precautions must be taken to prevent device damage or destruction.
Only those who are thoroughly familiar with industry accepted techniques for
handling static sensitive devices should attempt to service circuitry with these
devices.
Chapter 1
29
General Information
Documentation
Documentation
Conventions Used in This Manual
The following conventions are used throughout this manual to help
clarify instructions and reduce unnecessary text:
• “Test Set” refers to the Agilent 8935 CDMA Cellular/PCS Base
Station Test Set.
• Test Set keys are indicated like this: Preset
• Test Set screen information, such as a measurement result or an
error message, is shown like this: TX Channel Power -1.3 dBm
NOTE
HP-IB and GPIB are one and the same.
What Is In This Manual
Chapter 1 , “General Information,” on page 11.
This chapter contains generic information about the product, safety,
warranty, sales, and service offices, power-cables, and other
information.
Chapter 2 , “Product Information,” on page 35.
This chapter contains general information about the Test Set and
how to service it.
Chapter 3 , “Troubleshooting,” on page 47.
This chapter explains how to isolate a problem to the defective
assembly. Troubleshooting uses the Test Set’s built-in diagnostics. If
diagnostics can’t identify the faulty assembly, supplementary
information in the form of manual troubleshooting procedures is
provided.
Chapter 4 , “Preventative Maintenance,” on page 93.
This chapter describes the preventative maintenance procedures
recommended for the Test Set.
Chapter 5 , “Disassembly,” on page 101.
This chapter explains how to disassemble the Test Set for major
assembly replacement.
30
Chapter 1
General Information
Documentation
Chapter 6 , “Replaceable Parts,” on page 135.
This chapter contains the replaceable assembly and component
information for the Test Set. Use the illustrations in this chapter to
identify the replaceable parts and the “Parts List” on page 150 for
part numbers.
Chapter 7 , “Periodic Adjustments,” on page 157.
This chapter contains the periodic adjustment procedures for the
Test Set.
Chapter 8 , “Performance Tests,” on page 173.
This chapter contains the performance test procedures for the Test
Set. The tests in this chapter verify that the Test Set performs to its
published specifications.
Chapter 9 , “Performance Test Records,” on page 233.
Use this chapter to record the results of the performance tests in
Chapter 8 , “Performance Tests,” on page 173.
Chapter 10 , “Block Diagrams,” on page 283.
This chapter contains block diagrams and descriptions that focus on
how the Test Set generates signals and makes measurements. It also
has I/O signal and pin number information that can be used to help
isolate a problem to the assembly level if the Test Set’s diagnostic
programs are unable to do so.
Chapter 1
31
General Information
Documentation
Which Document is Required?
The following documents are part of the Agilent 8935 document set.
Use the table to help you decide which document you need.
Table 1-12
Document Navigation
Document
Part Number
Usage
CDMA Application
Guide
E6380-90016
Use this manual for basic CDMA
measurements and for getting started with
the Test Set.
AMPS Application
Guide
E6380-90017
Use this manual for making AMPS base
station measurements.
Reference Guide
E6380-90019
Use this manual for screen and field
descriptions and general operation
information about the Test Set.
GPIB Syntax
Reference Guide
E6380-90073
Use this manual as a reference to the syntax
and use of all available GPIB commands.
Programmer’s Guide
E6380-90018
Use this manual to learn GPIB syntax and for
learning how to program the Test Set.
Assembly Level Repair
Guide (this manual)
E6380-90015
Use this manual to perform calibration on the
Test Set and for general service information.
Technical
Specifications
Publication
5966-0512E
Test Set’s specifications data sheet
CDROM
E6380-90027
Includes all of the above documents.
32
Chapter 1
General Information
Trademark Acknowledgements
Trademark Acknowledgements
Hewlett-Packard and HP are registered trademarks of
Hewlett-Packard Company.
Microsoft‚ Windows, and MS-DOS‚ are registered trademarks of
Microsoft Corporation.
ProComm‚ is a registered trademark of DataStorm Technologies, Inc.
HyperTerminal is a registered trademark of Hilgraeve, Incorporated.
Pentium is a registered trademark of Intel Corporation.
Chapter 1
33
General Information
Trademark Acknowledgements
34
Chapter 1
2
Product Information
This chapter contains general information about the Test Set and how
to service it.
35
Product Information
Instrument Description
Instrument Description
The Agilent 8935 CDMA Cellular/PCS Base Station Test Set is a
one-box tool designed to meet the needs of installation teams, service
providers, and network manufacturers when installing, testing, and
maintaining CDMA base stations at both the cellular and PCS
frequency bands. It also can be used to test AMPS base stations.
Features include:
• Waveform quality rho (ρ), frequency error, code domain power,
timing, and phase analysis
• Analog and digital (CDMA) capabilities
• Firmware upgradeable via PCMCIA to flash memory
• Automation software to increase measurement repeatability
• Built-in AWGN source for calibrated Eb/No settings
Figure 2-1
The Agilent 8935 CDMA Cellular/PCS Base Station Test Set
e6380_1.eps
This Test Set utilizes a bright electroluminescent display for reading
data. All connectors are recessed and mounted on one side allowing
unobstructed, out-of-the-way hook up. Its rugged design includes a
hand strap for portability, a membrane keypad, gasketed display, stand
up operation, filtered airflow, and a rugged exterior to help the Test Set
from bumps and shocks.
36
Chapter 2
Product Information
Instrument Description
The user interface features pull down menus, one-key measurement
execution, and fast measurement speed. Measurement data can be
output to a printer or a PCMCIA memory card.
The Test Set’s firmware is user upgradeable with a PCMCIA card to
flash memory. Thus, new features and capabilities can be added
without returning the unit to the service center.
The Test Set contains a CDMA signal generator and a frequency
translator which allow generation of CDMA signals at both cellular and
PCS frequencies. CDMA tools include:
• Code Domain Analyzer
• CDMA Analyzer
• CDMA Generator
• Power Meter (both wideband and channel)
Other test tools include:
• Spectrum Analyzer
• Oscilloscope
• AMPS Analyzer
• AC/DC Voltmeter
• Audio and RF Generators
• Built-in IBASIC Controller
For documentation on this Test Set, see “Manuals” on page 45.
Chapter 2
37
Product Information
Instrument Description
Instrument Assemblies
Table 2-1 and Figure 2-2 on page 39 describe the assemblies of the
Agilent 8935 CDMA Cellular/PCS Base Station Test Set.
Table 2-1
Chapter 1 , “General Information,” on page 11.
Reference
Designator
Assembly Name
Function
A1
Front Panel Assembly
Contains display and keyboard sub assemblies
A1A3
RPG Board
Interface for front-panel-knob rotary pulse
generator
A2A1
Motherboard
Provides connection and interface for assemblies
A2A10
PCMCIA
Control of PC card reader
A2A20
Spectrum Analyzer
Signal spectrum analyzer
A2A21
Receiver
IF filtering and demodulation
A2A22
Receiver Synthesizer
Supplies LO signal for IF creation
A2A23
Reference
Standard or high-stability reference oscillator
A2A24
Output Section
Conditions signal for output of instrument
A2A25
Signal Generator
Synthesizer
Provides CW signal for RF generator
A2A30
Memory/SBRC
Test Set’s RAM and gated bus control
A2A31
Controller
Overall instrument control
A2A32
Signaling Source and
Analyzer
Source for the RF generator system and analyzer
for the audio analyzer system
A2A33
Measurement
Provides oscilloscope, voltmeter, and counter
functions
A2A34
Data Buffer
Provides data buffering and reverse link
modulation
A2A36
Receive DSP (RX DSP)
Digital signal processing for the CDMA Analyzer
A2A40
Audio Analyzer 2
Provides audio distortion analysis
A2A44
Modulation Distribution
Source of FM
A2A50
Display Drive
Controls EL display
A2A70
Control Interface
Interface between instrument and side-panel parts
A2A80
Audio Analyzer 1
Provides audio filtering
A2A80A1
C-Message Filter
Audio filter
A2A80A2
6 kHz Bandpass Filter
Audio filter
38
Chapter 2
Product Information
Instrument Description
Table 2-1
Chapter 1 , “General Information,” on page 11.
Reference
Designator
Assembly Name
Function
A2A100
Generator Reference (Gen
Ref)
CDMA data generation and instrument reference
master (with external reference)
A2A110
Upconverter
Converts output signal to PCS frequencies
A2A115
Downconverter
Converts input frequencies to instrument level IF
A2A120
LO IF/IQ Modulator
Receive-path IF downconversion and
generator-path IQ modulation
A2A130
RF Input/Output
RF input and output is directed through one
assembly
A2A200
100 W Attenuator
Provides high-power RF attenuation
A2U1
DC Block Assembly
Standard AC Coupled feature on the RF Input /
Output connector. Test sets with a serial prefix
greater than GB4005xxxx included this feature
and can be recognized by the AC Coupled label by
the RF IN/Out connector
A3
Power Supply assembly
Contains power supply, regulator, and fan
assemblies
A3A1
Power Supply Regulator
Regulates the power supply voltages
Chapter 2
39
ANT
IN
Input
Attenuator
OPP
Receiver &
Demod
IF
(FM, AM, SSB)
A2A21
Downconverter
A2A115
Block
Speaker
(Bandpass
Filters)
(Distortion)
Volume
SCOPE MONITOR OUT
A2A40
A2A80
AUDIO IN
Power
Detector
RF
IN/OUT
Measurement
(Scope)
(Voltmeter)
(Counter)
100 W
Attenuator
A2A200
RF Analyzer
DUPLEX
OUT
RPP
Output
Attenuator
EXT AC
Input
RF I/O
A2A130
Signaling
Analyzer
A2A32
LO/IF
Conversion
A2A120
Regulators
A3A1
Power Supplies
EXT SCOPE TRIGGER IN
A2A33
Audio Analyzer
Splitter
Receive
DSP
A2A36
CDMA Analyzer
CDMA Clocks
HP-IB
Control
Interface
A2A70
Serial Ports
Parallel Ports
Reference
Controller
A2A31
A2A23
Memory/
SBRC
A2A30
Data Buffer
Modulator
A2A34
Display
Drive
A2A50
CDMA Generator
EL Display
Upconverter
A2A110
PC Card
t
VIDEO OUT
PCMCIA
Controller
A2A10
Inst. Control
Chapter 2
OPP - Over Power Protection
RPP - Reverse Power Protection
SBRC - Serial Bus Receiver Chip
CDMA
Generator
Reference
A2A100
Output
Section
A2A24
IQ
Mod
A2A120
Sig Gen
Synth
A2A25
RF Generator
Mod
Distribution
A2A44
Signaling
Source
A2A32
EVEN SECOND SYNC IN
EXT REF IN
TRIGGER QUALIFIER IN
10 MHz REF OUT
BASEBAND OUT
Serial Data
ANALOG MODULATION IN
Audio Generator
Product Information
Instrument Description
Spectrum
Analyzer
A2A20
Audio
Analyzer
Overall Block Diagram
40
Receiver
Synth
A2A22
DC
Squelch
Figure 2-2
CDMA BASE STATION TEST SET OVERALL BLOCK DIAGRAM
Product Information
Upgrades
Upgrades
Hardware and Firmware Enhancements
The hardware and firmware for this Test Set are being enhanced on a
continuous basis. Hardware can be upgraded by ordering a specific
retrofit kit. Firmware is upgraded by downloading new software or
installing new PROMs. The firmware for this Test Set has gone through
several revisions to improve performance and fix problems.
It is recommended that the firmware be upgraded to the latest revision
whenever the Test Set is repaired or a performance problem is found.
This is important especially if an assembly-level repair is performed by
the exchange of assemblies - the replacement assemblies may require a
later revision of the firmware for the assembly and/or Test Set to
function correctly.
When downloading new firmware, a program is used that downloads
the new firmware files from a PC memory card to the instrument. Table
2-2 and Table 2-3 list the upgrade kits available. For ordering
information, see “Service Information” on page 46.
Table 2-2
Table 2-3
Firmware Upgrade Kits
Kit
Description
E6380ART R58
Agilent 8935 CDMA Cellular/PCS Base Station Test
Set Firmware (for customer)
E6380ART RD5
Agilent 8935 CDMA Cellular/PCS Base Station Test
Set Firmware (for Agilent support personnel)
Hardware Upgrade Kit
Kit
Description
Agilent 8935 RD5
E6380A RD5
E6380ART R20
E6380ART R23
E6380ART R2K
•
•
•
•
High Stability Timebase
DC Block
Side Impact
CDMA_2000
Load the Host Firmware
The following procedure loads the host firmware.
1. Power the Test Set off.
2. Insert the E6380-10001 memory card into the Test Set.
3. Power on the Test Set.
Chapter 2
41
Product Information
Upgrades
4. Follow the instructions on the screen.
5. After the firmware is downloaded, be sure to cycle the Test Set’s
power off-and-on to complete this procedure.
Load the DSP Firmware
The following procedure loads the digital signal processor firmware.
1. Press the Preset key.
2. Insert the E6380-10002 memory card into the Test Set.
3. Press the Menu key.
4. Set the Select Procedure Location: field to Card.
5. Set the Select Procedure Filename field to DLFIRM.
6. Select Run Test (k1).
7. Follow the instructions on the screen.
After the firmware is downloaded, be sure to cycle the Test System’s
power.
CDMA 2000 Enable Process
The following procedure will allow you to enable the CDMA 2000
feature for the 8935 CDMA Base Station Test Set, (E6380A option 200):
1. Verify the test set is turned off.
2. Insert the Host FW card 1 of 2 into the PCMCIA card slot on the
front of the test set.
3. Power the unit on. Follow the on screen directions to start the Host
FW download procedure.
4. Once the second card is loaded, select the Menu screen.
5. Insert the DSP card 1of 1 into the PCMCIA card slot.
6. On the Menu screen, choose Card for Procedure Location.
7. Select DLFIRM for Procedure Filename.
8. Load and run the program by pressing the Run Test soft key, K1.
9. Once the DSP code is loaded, remove the DSP card and cycle power.
10.Insert the Config. Program card into the PCMCIA slot.
11.From the Menu screen select Card location and Config Filename.
12.Load and run the program by pressing the Run Test softkey, K1.
13.Follow the on screen direction to enable Option 200 (IS2000_CDMA).
42
Chapter 2
Product Information
Upgrades
14.Enter the firmware code word: This code word is unit specific and
can only be used with the unit for which it was ordered. If you have
more than one test set to upgrade you must associate the upgrade kit
with the serial number of the test set for which it was ordered.
15.Once the codeword is entered the program will prompt you to cycle
power to enable the CDMA 2000 feature.
After the Test set has fully booted you must choose the IS-2000 function
by selecting the Inst Config screen:
Move the cursor to the CDMA Std field on the Instrument Configure
screen and select IS-2000 to enable the CDMA 2000 functionality.
If you encounter any difficulty with this upgrade please email or call
Technical Support for additional assistance.
Checking Firmware Version
The following procedure checks the current version of firmware in the
Test Set.
1. Power on the Test Set.
2. Press the Inst Config key. The INSTRUMENT CONFIGURE screen
appears. The host firmware level appears in the upper right corner
of this screen.
3. To find the Receive (RX) DSP firmware revision level, select the title
bar of the INSTRUMENT CONFIGURE screen. A drop down menu
appears.
4. Select SERVICE. The SERVICE screen appears, see Figure 2-3 on
page 43.
Chapter 2
43
Product Information
Upgrades
Figure 2-3
SERVICE Screen
Title Bar
SERVICE Screen
SERVICE
Voltage
V
Frequency
kHz
Voltmeter Connection
RFIO_DIAG_0
Counter Connection
AUD1_COUNT
Gate Time
50.0
ms
Latch
sgnl_revision
value
19950310
hex
RAM Initialize
Clear all RAM and restart
service3.eps
5. Select the Latch field.
6. Move the cursor to rx_dsp_revision under the Choices: menu
and press the knob.
7. Read the Value data field. This is the RX DSP firmware revision
level. The value is actually a date in the form YYYYMMDD (Y=year,
M=month, D=day).
44
Chapter 2
Product Information
Repair Process
Repair Process
WARNING
SHOCK HAZARD. NO OPERATOR SERVICEABLE PARTS
INSIDE METALLIC ENCLOSURE. SERVICE BY QUALIFIED
PERSONNEL ONLY.
Repairing the Test Set consists of the following steps:
1. Isolate the problem to a faulty assembly within the Test Set. Refer to
Chapter 3 , “Troubleshooting,” on page 47.
2. Replace the faulty assembly.
3. Calibrate the Test System by regenerating calibration data, see
Chapter 7 , “Periodic Adjustments,” on page 157.
4. Verify the performance of the Test Set, see Chapter 8 , “Performance
Tests,” on page 173.
Lifting and Handling
When lifting and handling the Agilent 8935 CDMA Cellular/PCS Base
Station Test Set use ergonomically correct procedures. Lift and carry by
the strap on the side panel.
When moving the Test Set more than a few feet, be sure to replace the
front screen cover.
Consumables
Two AA alkalyne batteries are supplied with the Test Set and must be
replaced periodically. When replacing batteries always dispose of old
batteries in a conscientious manner, following manufacturer’s
instructions.
Chapter 2
45
Product Information
Manuals
Manuals
Operation and servicing the Agilent 8935 CDMA Cellular/PCS Base
Station Test Set are discussed in the following manuals:
• CDMA Application Guide E6380-90016
This manual explains how to use the Agilent 8935 Test Set to
manually test a CDMA Base Station. This document presents a
step-by-step approach to CDMA base station testing using the Test
Set, including what you need to know before you can start testing.
• Programmer’s Guide E6380-90018
How to perform IBASIC programming operations, such as writing,
editing, copying, or cataloguing programs.
• Assembly Level Repair Manual (ALR) - this manual E6380-90015
Includes assembly, troubleshooting, diagnostics, and repair
procedures and descriptions for the Test Set.
• Technical Specifications Publication 5966-0512E
• Reference Guide E6380-90019
• Agilent 8935 CDMA Cellular/PCS Base Station Test Set
E6380-90027 CD-ROM (Includes all or most of the above mentioned
manuals).
46
Chapter 2
Product Information
Service Information
Service Information
Factory Support
Troubleshooting assistance is available by e-mail (electronic mail),
website, or telephone:
• Internet e-mail address
support_wsp@agilent.com
• Agilent Support Website
Use the URL: http://www.agilent.com, select Products &
Services, then select Test & Measurement and finally select
Technical Support. A wide range of documentation, hardware
drivers and support information is available, including a part
number search engine.
• U.S.A. and Canada only, M-F 8am -5 pm PST,
toll free 1-800-827-3848 or 1-800-452-4844
• Outside North America, M-F 8 am - 5 pm PST,
phone 509-921-3848
• Application Support, M-F 8 am -5 pm PST,
phone 1-800-922-8920 or 1-800-452-4844
Ordering Parts
To order parts, call Agilent Global Support Logistics (GSL):
• U.S.A only,
Agilent Direct Parts Ordering, phone877-447-7278
• U.S.A and international,
Agilent Service Parts Identification, phone877-447-7278
Repair and Calibration/
Instrument Support Center
• USA only, 800-403-0801
Test & Measurement Call Center
• USA only, 800-452-4844
Chapter 2
47
3
Troubleshooting
This chapter explains how to isolate a problem to the defective
assembly. Troubleshooting uses the Test Set’s built-in diagnostics. If
diagnostics can’t identify the faulty assembly, supplementary
information in the form of manual troubleshooting procedures is
provided.
47
Troubleshooting
How to Troubleshoot the Test Set
How to Troubleshoot the Test Set
Document the result of each step in case you need to contact Agilent
Technologies for service assistance. General troubleshooting steps are
illustrated in Figure 3-2 on page 49.
NOTE
Periodic Adjustment Interval
The calibration programs Periodic Calibration, IQ Calibration and
Eb/No Calibration should be performed after the replacement of any
assembly referred to in Table 7-1 on page 159, or at least every 24
months. See Chapter 7 , “Periodic Adjustments,” on page 157 for details.
On power-up, the Test Set runs the Self-Test Diagnostic. Most of the
Test Set’s digital control functions are tested. The outcome of the test
appears on the display (if operating) and on four LEDs viewable
through an access hole in the top internal cover, see Figure 3-1.
Figure 3-1
LEDs
LEDs
32
10
k1©
k1
k2©
Men
u
k2
Res
et
Pau
se/
k3©
k3
Co
nti
CD
GenMA
nu
e
CD
AnlMA
k4©
k4
Ref
Incr
10
RF
Gen
Set
AF
Met
er
Incr
Set
Rel
eas
e
Lo
Incr
x 10
Lim
it
Sco
pe
Spe
Anl c
7
Shi
Shift
ft
Hi
Pu
sh
to
lec
t
4
9
5
Vol
um
Squ e
elch
6
B
RE
FE
Ent
er
F
1
RE
NC
Unl
ock
E
Inte
Ext rnal
ern
al
2
D
.
EEX
3
0
Sav
e
Rec
all
dB
GH
dBmz
C
A
Can
cel
Pre
set
Mea
Res s
et
Hol
d
8
limi
t
E
Se
leds_1
Cod
Dome
Anl
RF
Anl
Avg
k5
ADR
S
Loc
al
%
MH
V z
+/-
Yes
On/
Off
ppm
W
Pre
v
s
kHz
mV
No
Prin
Conter
fig
Prin
t
ms
%D
dBµ
V
mW
Hz
µV
I/O
Con
fig
Inst
Con
fig
Erro
Mesr
sag
e
Hel
p
48
Chapter 3
Troubleshooting
How to Troubleshoot the Test Set
Figure 3-2
Agilent 8935 Test Set Troubleshooting Flowchart
BEGIN
Step 1. Power-up the Test Set to run self diagnostics.
Did you hear the fan
running?
Check for faulty:
1. fan,
2. power supply
3. assembly pulling line voltage
low. See "If the Test Set Fails to
Power-up" on page 52.
NO
YES
YES
NO
Perform "Product
Verification" on page 90.
Turn off Test Set and remove external and internal covers.
Power-up Test Set and read Status LEDs for Self-Test
errors Refer to "Reading LED Codes" on page 56.
Is display screen
blank?
NO
Self-Test error YES
problem?
Component problem. Repair Test
Set and perform "Product
Verification" on page 90.
Display problem, replace display and perform "Product
Verification" on page 90.
NO
Does a self-test
error appear?
YES
Refer to "Reading Front
Panel or GPIB Codes"
on page 54.
NO
Misc. hardware or
SBRC problems?
YES
Turn off Test Set and remove
external and internal covers.
Power-up Test Set and read Status
LEDs for Self-Test errors. Refer to
"Reading LED Codes" on page 56.
Perform "Product Verification" on
page 90.
Step 2. Run the FUNCTIONAL DIAGNOSTICS on the SERVICE
MENU. See “Functional Diagnostics (Step 2)” on page 62.
Problem detected? YES
Repair Test Set
according to diagnostics.
Perform "Product
Verification" on page 90.
NO
Step 3. If you suspect that a problem still exists, run the AF, RF, and/or CDMA Diagnostics
test of the SERVICE4 program. See "Accessing the Diagnostic Tests" on page 62.
Problem detected?
YES
NO
Repair Test Set
according to diagnostics.
Perform "Product
Verification" on page 90.
Step 4. If you still suspect a problem, use the manual troubleshooting
procedures. See "Manual Troubleshooting Procedures (Step 4)" on page 75.
Problem detected?
YES
Repair Test Set according to findings.
NO
Perform "Product Verification" on page 90.
Chapter 3
49
Troubleshooting
Self-Test Diagnostics (Step 1)
Self-Test Diagnostics (Step 1)
On power-up the Test Set runs a self-test diagnostic test. Most of the
Test Set’s digital functions are tested. The outcome of the test appears
on the display (if operating) and on four LEDs viewable through an
access hole on the top internal cover.
The self-test diagnostic can be run three ways:
1. The test runs automatically when the Test Set is turned on. After
the Test Set powers up, a message appears at the top of the display.
If one or more tests fail, the message reports the failure with a
hexadecimal code.
During the test, coded failure information is displayed on four LEDs
on the top of the Controller (A2A31) assembly, see Figure 3-5 on page
53. The Test Set’s cover must be removed to view these LEDs. See
chapter 3 for disassembly and replacement instructions.
2. The test runs when the Test Set receives the query *TST? over GPIB.
The resultant decimal code can be read over the bus.
3. The test runs when the Self Test menu item of the Functional
Diagnostics menu is selected.
50
Chapter 3
Troubleshooting
Self-Test Diagnostics (Step 1)
To Start Troubleshooting
1. Turn on the Test Set to automatically run the self test diagnostics.
• If the Test Set does not power up, see “If the Test Set Fails to
Power-up” on page 52.
• If all self-test diagnostics pass, and the front-panel keys and knob
work, you can assume that the digital control assemblies work.
2. After power-up, the top line of the Test Set’s display should show
copyright information and the firmware revision code. The second
line should display All self tests passed.
• If the Test Set powers-up with “One or more self-tests
failed. Error code:<hexadecimal error code>:”, see
“Reading Front Panel or GPIB Codes” on page 54.
• See “Frequently Encountered Diagnostic Messages” on page 73.
for other error messages that might appear on the second line of
the display.
3. The CDMA ANALYZER screen should be displayed. Two conditions
cause a different screen to be displayed on power-up:
❏ A SAVE/RECALL register named POWERON was saved to
automatically power-up the Test Set in a different state. Press the
Preset key before proceeding; this will restore the Test Set to the
factory power-up condition.
❏ The Autostart Test Procedure on Power-Up: field (of the
“TESTS [Execution Conditions]” screen) is set to On to
automatically run a loaded program. Press the Shift key, then
press the Cancel key to stop the program. Press the Preset key to
restore the Test Set to the factory power-up condition.
To turn the autostart function off, press the Menu key, then select
Execution Cond (under the SET UP TEST SET: heading). The
autostart function is at the bottom of the screen; turn it Off.
Chapter 3
51
Troubleshooting
Self-Test Diagnostics (Step 1)
If the Test Set Fails to Power-up
1. Is the Test Set plugged in? Listen for fan operation. If you don’t hear
it, check the line fuse (Figure 3-3) and the GFI reset button, see
“Reset and GFI-Test Buttons (older units with GFI circuit)” on page
98.
Figure 3-3
Fuse
Line Fuse
(A3F1)
Spare Fuse
(A3F1)
fuse1.eps
2. If there is no image on the display, remove the Test Set’s covers and
check the power supply LEDs: +5V, −12V, +12V (see Figure 3-4). If
one is out, the power supply or regulator board is faulty. If no LEDs
are lit, confirm that the Test Set is connected to the main power
source. (Also, see step 5.)
52
Chapter 3
Troubleshooting
Self-Test Diagnostics (Step 1)
Figure 3-4
Power Supply LEDs
3. Check the LEDs on the A2A31 Controller assembly, see Figure 3-5
on page 53. The LEDs should all light up immediately on power-up,
and then go off several seconds after a beep is heard. If the LEDs do
not light when the Test Set is powered-up, either the Controller or
the Memory/SBRC (A2A30) assembly is faulty.
Figure 3-5
A2A31 Controller Assembly
LEDs
32
10
k1©
k1
k2©
Men
k2
u
k3©
k3
Res
et
Pau
se/
CDM
Gen A
Co
ntin
ue
k4©
k4
R
RF
G
CDM
Anl A
Shif
t
4. If the Test Set does not power-up properly, but the fan operates and
the power supply voltages are correct on the Power Supply Regulator
(A3A1) outputs, the Controller (A2A31) may be failing. Check TP2 on
the Controller for +5V. If +5V is present, the Controller assembly is
faulty.
5. If there is no display, but VIDEO OUT port on the side-panel has the
signal shown in Figure 3-6, then the A1A1 Display assembly is
faulty. If the signal is not present, then Display Drive A2A50
assembly is faulty.
Chapter 3
53
Troubleshooting
Self-Test Diagnostics (Step 1)
Figure 3-6
VIDEO OUT Signal
500mV/div.
500µs/div.
Reading Front Panel or GPIB Codes
Failure codes are listed in the table below. If more than one failure
occurs, the failure code will be the sum of the individual failure codes.
The nature of the failure and the assembly most-likely at fault is also
listed.
54
Chapter 3
Troubleshooting
Self-Test Diagnostics (Step 1)
Table 3-1
Return Values for Self-Test Diagnostic Failures
Detected Failure
Failed Assembly
Returned Error Code
Hexadecimal
(displayed)
Decimal
(GPIB)
Microprocessor
A2A31 Controller
0002
2
ROM
A2A31 Controller
0004
4
RAM
A2A30 Memory/SBRC
0008
8
RAM
A2A30 Memory/SBRC
0010
16
Timer
A2A31 Controller
0020
32
Real-Time Clock
A2A30 Memory
0040
64
Keyboard (stuck key)
A1A2 Keypad1
0080
128
RS-232 I/O
A2A30 Memory/SBRC
0100
256
Serial Bus Communication
Any Non-Optional
assembly 2
0200
512
Signaling Board Self-Test
A2A32 Signaling
Source/Analyzer
0400
1024
Display Drive Self-Test
A2A50 Display Drive
0800
2048
Miscellaneous Hardware
Several Possible
Assemblies 3
1000
4096
1. Could also be the A2A31 Controller with a faulty key-down detector.
2. This checks the ability of the Controller to communicate with any hardware
on the bus.
3. This message occurs if expected hardware is absent or not responding to the
Controller.
Chapter 3
55
Troubleshooting
Self-Test Diagnostics (Step 1)
Reading LED Codes
When the self-test diagnostic reports a failure, more information about
the failure may be available inside the Test Set. This additional
information is output to the four LEDs on the top of the A2A31
Controller assembly. The failure codes are sent out as code sequences.
Figure 3-7 on page 58 and the tables following it document some of the
more useful code sequences. You may need to run the Self-Test
Diagnostic several times to decode a particular LED sequence.
NOTE
The LEDs output self-test diagnostic codes only when the Test Set is
powering up. The LEDs remain off when the self-test diagnostic is
initiated through programming or when running the functional
diagnostics. To read the LED codes, the Test Set’s cover must be
removed.
If the Test Set has no faults that can be detected by the Self-Test
Diagnostic, the four LEDs on the Controller assembly will light and
remain on for about ten seconds. During that period, a short beep will
be heard. Then the LEDs will extinguish and remain off.
If a fault is detected during the test:
1. The four LEDs will go on for about four seconds.
2. The LEDs will blink a failure code which corresponds to the error
listed in Table 3-1 on page 55. Figure 3-8, "First LED Patterns," on
page 59 shows the blinking LED codes.
3. Two non-blinking LED codes will follow. The interpretation of these
codes depends on the preceding blinking code. Two sets of the
non-blinking codes are listed: see Figure 3-9 on page 60 and Figure
3-10 on page 61.
4. If there is more than one failure, the test will loop back to step 2 and
repeat until the last failure is reported.
56
Chapter 3
Troubleshooting
Self-Test Diagnostics (Step 1)
The pattern generated by the LEDs can be interpreted as a
binary-weighting code. The LED (labeled 0) is the least-significant bit
(see Figure 3-7 on page 58).
For example if the LEDs blinking pattern is Off, On, On, On (reading
left-to-right or LEDs “3 2 1 0”), the binary number is 0111 or decimal 7.
The error codes shown in Table 3-1 on page 55 are weighted by the
binary value. The weighted value for this example is decimal 27 = 128
or hexadecimal 80. (This failure is easy to simulate; simply power-up
the Test Set while holding down a key.)
Chapter 3
57
Troubleshooting
Self-Test Diagnostics (Step 1)
Figure 3-7
Reading the Self-Test Diagnostic. The Internal LEDs
1. Remove the Test Set’s external cover.
LEDs
32
10
2. Turn power on.
3. Read the LED sequence (see illustration
on right) and compare with the patterns
below.
NOTE
For multiple failures, the failure
patterns described below will repeat
for all failures detected.
k1©
k1
k2©
Men
k2
u
Rese
k3©
t
Paus
k3
CDM
Gen A
Cone/
tinu
e
CDM
Anl A
k4©
k4
Ref
Incr
10
RF
Gen
Set
Incr r
Set
ase
Lo
AF
Mete
Rele
k5
Scop
Spec
Anl
7
Shif
t
Shif
t
Hi
Pus
h
to
Pres
e
et
Mea
Reses
t
Hold
8
limit
9
E
Sel
ect
leds_1
Code
Dom
Anl
RF
Anl
Avg
Incr
x 10
Limit
4
Ente
r
F
5
Volu
Squ me
elch
1
REF
ERE
Unlo NC
E
Inter ck
el
ADR
S
Loca
l
D
3
A
Canc
ll
dB
GHz
dBm
C
2
Exte nal
rnal
Save
Reca
6
B
0
%
MHz
V
.
On/O
ff
No
ppm
W
Prev
EEX
+/-
Yes
s
kHz
mV
Print
Confer
ig
Print
ms
%D
dBµV
mW
Hz
µV
I/O
Conf
ig
Inst
Conf
ig
Erro
Mesr
sage
Help
LED Sequences
No Failures...
The LEDs will light
for approximately
10 seconds, then all
will turn off.
3
2
1
Failures... three patterns are displayed:
The second and third
The first blinks rapidly
patterns blink slowly and
and indicates the type of
indicate failure details.
failure.
0
3
2
1
0
See the following
tables. (This example
indicates a Serial Bus
Communication
problem.)
3
2
1
0 3
2
1
0
(This example indicates a
faulty A2A80 Audio Analyzer
1 assembly.)
LED Legend
= off
= rapid blink
= steady on or slow blink
58
Chapter 3
Troubleshooting
Self-Test Diagnostics (Step 1)
Figure 3-8
First LED Patterns
If the first LED
pattern displayed is...
3
2
1
Then the failure is...
0
ROM Checksum (See note 1.)
LED Legend
= off
= rapid blink
RAM (See note 2.)
= steady on or slow blink
Microprocessor
RAM (See note 3.)
Timer
Real-Time Clock
Keyboard (stuck key or faulty key-down detector)
Control Interface, A2A70 (See note 4.)
Serial Bus Communication (see figure 3-9 on page 60)
Signaling Board Self Test
Display Drive Self Test
Miscellaneous Hardware (see figure 3-10 on page 61)
NOTES
1. Second and third LED failure patterns:
0001 and 0001 for any main ROM failure
0001 and 0002 for boot ROM failure
2. Second and third LED failure patterns:
0001 and 0001 for A2A30 Memory/SBRC board RAM failure
0001 and 0002 for A2A31 Controller board RAM failure
3. Second and third LED failure patterns:
0001 and 0001 for A2A30 Memory/SBRC board RAM failure
0001 and 0010 for A2A30 Memory/SBRC board RAM failure
4. Second and third LED failure patterns for Control Interface:
0001 and 0001 for Serial Port 9 failure
0001 and 0010 for Serial Port 10 failure
Chapter 3
59
Troubleshooting
Self-Test Diagnostics (Step 1)
Figure 3-9
Non-blinking LED Codes For Serial Bus Communication Failure
If the second and third LED
patterns displayed are....
3
2
1 0
3
2
Then the failure is...
1 0
A2A44 Modulation Distribution
A2A24 Output Section
A2A80 Audio Analyzer 1
A2A40 Audio Analyzer 2
A2A23 Reference
A2A130 RF Input/Output
A2A115 Downconverter
A2A21 Receiver
A2A20 Spectrum Analyzer
A2A25 Signal Generator Synthesizer
A2A22 Receiver Synthesizer
A2A110 Upconverter
A2A120 LO IF/IQ Modulator
A2A100 CDMA Generator Reference
A2A34 Data Buffer
LED Legend
= off
= rapid blink
= steady on or slow blink
60
Chapter 3
Troubleshooting
Self-Test Diagnostics (Step 1)
Figure 3-10
Non-Blinking LED Codes for Miscellaneous Hardware Failure
Then the failure is...
If the second and third
LED patterns displayed
3
2
1 0
3
2
1 0
A2A23 Reference
A2A80A1 Audio Filter 1 - C-Message Filter
A2A80A2 Audio Filter 2 - 6 kHz BPF
A2A36 Receive DSP
A2A34 Data Buffer
LED Legend
= off
= rapid blink
= steady on or slow blink
= don’t care
Chapter 3
61
Troubleshooting
Functional Diagnostics (Step 2)
Functional Diagnostics (Step 2)
The Functional Diagnostics (of the SERVICE MENU, shown in Figure
3-11 on page 65) check whether or not major portions of the Test Set are
functioning. They may pinpoint faults in the circuitry to the faulty
assembly, or they may direct the use of any or all of the AF, RF, CDMA
diagnostics to more extensively test the circuitry.
Accessing the Diagnostic Tests
CAUTION
A fifteen minute warm up is required. The measurement limits of the
SERVICE4 diagnostic tests are valid only at room temperature; that is,
20º to 25ºC (65º to 75ºF).
1. Press the Preset key.
2. Press the Menu key. The SOFTWARE MENU screen appears, see
Figure 3-11 on page 65.
3. Set the Select Procedure Location: field to ROM.
4. Set the Select Procedure Filename: field to SERVICE4.
5. To define test conditions, see “Define Test Conditions” on page 63. To
configure the Test Set for a printer, see “Configuring a Printer” on
page 64.
6. On the SOFTWARE MENU, select the Run Test field (or press k1),
and wait for the SERVICE MENU screen.
7. Choose the diagnostic test (Functional, AF, RF, or CDMA) to run by
turning the knob to move the pointer and then pressing the knob to
select the test.
8. Follow the instructions on the screen.
As some of the tests run, you may be offered the options to alter test
execution conditions by selecting:
• Loop to run the test continuously
• Pause to pause the tests
• Stp Fail (stop-failure) to stop on a failure
• Sgl Step (single-step) to pause the test after each measurement
62
Chapter 3
Troubleshooting
Functional Diagnostics (Step 2)
For descriptions of the diagnostic options, refer to:
• “Functional Diagnostics Menu” on page 66.
• “AF Diagnostics” on page 68.
• “RF Diagnostics” on page 70.
• “CDMA Diagnostics” on page 72.
Define Test Conditions
1. On the SOFTWARE MENU screen (see Figure 3-11 on page 65),
select Execution Cond to access the TESTS (Execution Conditions)
screen.
2. Set up the Output Results To: field. Select:
• Crt to view measurements only on the display.
• Select Printer to print the test results as well as display them
on the CRT.
3. Set the Output Results For: field to All
4. Set up the If Unit-Under-Test Fails: field.
• Select Continue to continue to the next test point.
• Select Stop to pause testing at that point.
5. Set up the Test Procedure Run Mode: field.
• Select Continuous to run the tests continuously.
• Select Single Step to pause after each measurement.
6. Verify that the Autostart Test Procedure on Power-Up: setting
is Off.
Chapter 3
63
Troubleshooting
Functional Diagnostics (Step 2)
Configuring a Printer
Only perform the following steps if you want to print test results to a
printer.
1. If you are not already at the SOFTWARE MENU screen, press the
Menu key.
2. Under SET UP TEST SET:, select Print to access the “TESTS
(Printer Setup)” screen.
3. Under PRINT SETUP:, select Model: and the printer of your choice.
4. Set the Printer Port: for the side-panel connector your printer is
connected to (Parallel 15, Serial 9, or GPIB).
If an GPIB printer is used, you need to enter the printer’s two-digit
bus address when the Printer Adrs field appears (Example; enter 1
or 01 for bus address 701). Also, press the Shift key, then the INST
CONFIG key to access the I\O CONFIGURE screen, and set the Mode
field to Control.
5. Under PAGE CONTROL:, set the Lines/Page: and Form Feed (FF at
Start:, and FF at End:) parameters if necessary.
64
Chapter 3
Troubleshooting
Functional Diagnostics (Step 2)
Figure 3-11
SERVICE4 Program Screens
SOFTWARE MENU Screen
SOFTWARE MENU
1 Run Test
LOAD TEST PROCEDURE:
Select Procedure Location:
ROM
Select Procedure Filename:
SERVICE4
Functional Diagnostics Screen
2 Continue
1
Library:
[NO LIB]
Program:
ROM
Description:
Launches disgnostic and calibration programs.
4 Help
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu to
go to the Service Menu, Exit key to abort.
2
3
CUSTOMIZE TEST PROCEDURE:
Freq Channel Information
Parm Test Parameters
Seqn Order of Tests
Spec Pass/Fail Limits
Proc Save/Delete Procedure
SET UP TEST SET:
Exec Execution Cond
Cnfg External Devices
Print Printer Setup
IBASIC IBASIC Cntrl
=> RF Modules
Analog Modulation
CDMA Loopback
Self Test
Power Supplies
4 Serv Menu
5 Exit
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to the desired program using the
knob then press the knob. Press HELP for
information on the tests. Press EXIT to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
AF Diagnostics Screen
2
1
3
4 Help
5 Exit
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu to
go to the Service Menu, Exit key to abort.
2
3
=> All Audio Tests
Audio Frequency Generators 1 and 2
Preliminary Audio Path
Mod Distribution Internal Paths
Mod Distribution External Paths
Audio Analyzer 1 Internal Paths
Audio Analyzer 1 External Paths
Audio Analyzer 2
4 Serv Menu
5 Exit
RF Diagnostics Screen
1
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu
to go to the Service Menu, Exit key to abort.
Run at room temperature after 15 minute warmup.
=> All RF Tests
Reference
Signal Generator Synthesizer
Receiver Synthesizer
Output
Upconverter
RF Input/Output
Down Converter
Spectrum Analyzer
Receiver
CDMA Loopback Screen
2
3
1
INSTRUCTIONS
2
Connect DUPLEX OUT to ANT IN with a short cable.
4 Serv Menu
5 Exit
Select Resume to continue, Serv Menu to go to the
Service Menu, Exit to abort.
3
Resume
4
Serv Menu
5
Exit
dscreen1.eps
Chapter 3
65
Troubleshooting
Functional Diagnostics (Step 2)
Functional Diagnostics Menu
To run the functional diagnostics, see “Accessing the Diagnostic Tests”
on page 62.
NOTE
The diagnostics are intended to help in locating the source of
catastrophic failures. Occasionally, a test will fail with the test results
being only slightly out of limits. Such failures do not necessarily
indicate that the Test Set is operating outside of its published
specifications or that it is otherwise faulty. Further testing (such as
running the performance tests) will be required in such cases.
NOTE
Many of the internal diagnostic and calibration procedures use
low-level latch commands to control the instrument settings. Many
latch settings persist even through a preset. They can only be reset by
an instrument power down or by explicitly reseting each latch. This
phenomenon is the reason the message “Direct latch write
occurred. Cycle power when done servicing.” is displayed the first
time a latch is written to. Because latch settings persist, problems can
arise in running these programs. For example, prematurely
terminating a test in a diagnostic (using the Pause and Exit keys) and
restarting another test may cause failures in that test because of
improper latch settings. It is best to run tests to completion before
starting another one. Also, be sure to cycle the power off and on when
done servicing the Test Set.
66
Chapter 3
Troubleshooting
Functional Diagnostics (Step 2)
Figure 3-12
Functional Diagnostics Screen
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu to
go to the Service Menu, Exit key to abort.
2
3
4 Help
1
5 Exit
2
3
Functional
Diagnostics
Screen
=> RF Modules
Analog Modulation
CDMA Loopback
Self Test
Power Supplies
4 Sev Menu
5 Exit
funcscrn.eps
RF Modules
The Average and TX power meters, RF analyzer, IF analyzer, DSP
analyzer, and spectrum analyzer are used to test the signal generator.
Both the internal and external paths of the RF/IO assembly are used in
the tests.
Analog Modulation
The demodulator in the RF analyzer, and the spectrum analyzer are
used to check the accuracy, distortion, and residuals of the FM and AM
frequencies. The counter is used to measure the audio frequency.
CDMA Loopback
CDMA Analyzer is used to measure Rho, Time Offset, Frequency Error,
and Carrier Feedthrough on a signal from the CDMA Generator.
Self Test
The power-up Self-Test Diagnostics are run. Refer to “Self-Test
Diagnostics (Step 1)” on page 50.
Power Supplies
The different levels of the power supply are measured with the internal
voltmeter.
Chapter 3
67
Troubleshooting
AF, RF, & CDMA Diagnostics (Step 3)
AF, RF, & CDMA Diagnostics (Step 3)
NOTE
The diagnostics are intended to help in locating the source of
catastrophic failures. Occasionally, a test will fail with the test results
being only slightly out of limits. Such failures do not necessarily
indicate that the Test Set is operating outside of its published
specifications or that it is otherwise faulty. Further testing (such as
running the performance tests) will be required in such cases.
NOTE
Many of the internal diagnostic and calibration procedures use
low-level latch commands to control the instrument settings. Many
latch settings persist even through a preset. They can only be reset by
an instrument power down or by explicitly reseting each latch. This
phenomenon is the reason the message “Direct latch write
occurred. Cycle power when done servicing.” is displayed the first
time a latch is written to. Because latch settings persist, problems can
arise in running these programs. For example, prematurely
terminating a test in a diagnostic (using the Pause and Exit keys) and
restarting another test may cause failures in that test because of
improper latch settings. It is best to run tests to completion before
starting another one. Also, be sure to cycle the power off and on when
done servicing the Test Set.
AF Diagnostics
This program tests the audio functions of the following assemblies:
• A2A40 Audio Analyzer 2
• A2A80 Audio Analyzer 1
• A2A44 Modulation Distribution
• A2A32 Signaling Source/Analyzer (AF Generators 1 and 2 only)
• A2A33 Measurement (only a few selected inputs)
After initial cabling, all tests can be run in a loop mode without further
intervention. This makes it easier to catch intermittent failures. To run
the AF diagnostics, see “Accessing the Diagnostic Tests” on page 62.
NOTE
A fifteen minute warm up is required. The measurement limits of the
SERVICE4 diagnostic tests are valid only at room temperature; that is,
20º to 25ºC (65º to 75ºF).
68
Chapter 3
Troubleshooting
AF, RF, & CDMA Diagnostics (Step 3)
Figure 3-13
AF Diagnostics Screen
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu to
go to the Service Menu, Exit key to abort.
AF Diagnostics
Screen
=> All Audio Tests
Audio Frequency Generators 1 and 2
Preliminary Audio Path
Mod Distribution Internal Paths
Mod Distribution External Paths
Audio Analyzer 1 Internal Paths
Audio Analyzer 1 External Paths
Audio Analyzer 2
2
3
4 Help
1
5 Exit
2
3
4 Serv Menu
5 Exit
afscrn1.eps
When a test fails, a diagnosis is given in three parts:
• A diagnostic code.
• The name of the assembly or assemblies most likely to have failed.
• A rating of the confidence (high, medium, or low) of the diagnosis.
Chapter 3
69
Troubleshooting
AF, RF, & CDMA Diagnostics (Step 3)
RF Diagnostics
This program tests the RF functions of the following assemblies:
• A2A115 Downconverter
• A2A24 RF Output
• A2A25 Signal Generator Synthesizer
• A2A23 Reference
• A2A21 Receiver
• A2A22 Receiver Synthesizer
• A2A20 Spectrum Analyzer
• A2A130 RF I/O
• A2A110 Upconverter
Some tests require cabling before the RF Diagnostics can be run; but all
tests can be run in a loop mode without further intervention. Running
in loop mode makes it easier to catch intermittent failures. To run these
diagnostics, see “RF Diagnostics” on page 70.
NOTE
A fifteen minute warm up is required. The measurement limits of the
SERVICE4 diagnostic tests are valid only at room temperature; that is,
20º to 25ºC (65º to 75ºF).
70
Chapter 3
Troubleshooting
AF, RF, & CDMA Diagnostics (Step 3)
Figure 3-14
RF Diagnostics Screen
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu
to go to the Service Menu, Exit key to abort.
Run at room temperature after 15 minute warmup.
RF Diagnostics
Screen
=> All RF Tests
Reference
Signal Generator Synthesizer
Receiver Synthesizer
Output
Upconverter
RF Input/Output
Down Converter
Spectrum Analyzer
Receiver
2
3
4 Help
5 Exit 1
2
3
4 Serv Menu
5 Exit
rfscrn1.eps
When a test fails, a diagnosis is given as:
• Sometimes a diagnostic code.
• The name of the assembly or assemblies most likely to have failed.
• Sometimes a rating (high, medium, or low) of the confidence of the
diagnosis.
Chapter 3
71
Troubleshooting
AF, RF, & CDMA Diagnostics (Step 3)
CDMA Diagnostics
This program tests the local oscillators and the power supplies of the
following assemblies:
• A2A120 LO IF/IQ Modulator - LO IF portion only
• A2A100 CDMA Generator Reference
To run CDMA diagnostics, see “CDMA Diagnostics” on page 72.
NOTE
Before ordering a replacement assembly...
Before ordering an assembly based on the results of the diagnostics, you
should verify the diagnostics by other means if possible. This could
include using manual troubleshooting procedures and descriptions of
the AF, RF, and CDMA diagnostics in this chapter, and/or block
diagrams in Chapter 10 , “Block Diagrams,” on page 283. If you still
lack confidence in troubleshooting or diagnosing the problem or faulty
assembly, call “Factory Support” on page 46, for troubleshooting
assistance.
Figure 3-15
CDMA Diagnostics Screen
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
INSTRUCTIONS
2
3
4 Help
5 Exit
1
2
Connect DUPLEX OUT to ANT IN with a short cable.
Select Resume to continue, Serv Menu to go to the
Service Menu, Exit to abort.
3 Resume
4 Serv Menu
CDMA Diagnostics
Screen
5 Exit
cdmascrn.eps
72
Chapter 3
Troubleshooting
Frequently Encountered Diagnostic Messages
Frequently Encountered Diagnostic Messages
Warning/Error Messages
Error messages that appear on the second line of the Test Set’s display
frequently occur while any of the SERVICE4 program diagnostic tests
are running. The most complete and general list of error messages is in
the “Error Messages” chapter of the Test Set’s Reference Guide. (Some
messages relating specifically to troubleshooting can be found in
Appendix A , “Error Messages,” on page 321.) Some of the messages you
can expect to occur while running the SERVICE4 program diagnostic
tests are as follows:
• Direct latch write occurred. Cycle power when done
servicing. The SERVICE4 program commonly generates this
message. This message appears the first time the diagnostic
program directly addresses a latch. The message should be ignored
and cleared when you make a normal (not a diagnostic)
measurement with the Test Set. To clear this message the Test Set
should be turned off and back on again.
• Change Ref Level, Input Port or Attenuator (if using
“Hold”). This message, and similar messages, can be generally
ignored.
• Printer does not respond. This usually indicates that one or
more settings on the TESTS (Printer Setup) screen are set
incorrectly for your printer. Also, check that the printer’s power is on
and that it is correctly cabled. For GPIB printers make sure the
printer is correctly addressed. If a serial printer is used, you may
have to change the serial communication settings on the I/O
CONFIGURE screen (press Shift then Inst Config to get to this
screen). The message times out after a few seconds, and the output
destination is changed to CRT by the program.
• ERROR 173 IN XXXX Active/system controller req’d (where
”XXXX” represents a line number). Indicates that the Test Set’s
internal IBASIC computer must be set as a system controller for
some reason. This usually indicates that the Printer Port field of
the TESTS (Printer Setup) screen was set to HP-IB but the Mode field
on the I/O CONFIGURE screen is set to Talk&Lstn instead of
Control. Change the mode setting to Control and run the
diagnostic again.
Chapter 3
73
Troubleshooting
Frequently Encountered Diagnostic Messages
Time-outs
Certain failures may cause a frequency or voltage reading to time out,
that is, the time required for the measurement will be unreasonably
long. If a timeout occurs, measurement execution will stop and an error
message will be displayed.
• If frequency or voltage readings have been successfully made before
the timeout, the assembly currently being tested or a multiplexer on
the A2A33 Measurement assembly may be at fault.
• If most measurements fail, the A2A23 Reference assembly may be
supplying faulty clock signals to the A2A33 Measurement assembly.
• Re-run the test to see if the timeout is intermittent.
74
Chapter 3
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Manual Troubleshooting Procedures (Step 4)
If you are not sure a problem exists, you should attempt to duplicate the
suspected problem. This is especially important if the Test Set is being
used in a new application where misapplication, or incorrect operation
of the Test Set may be involved.
An Agilent 8924C Mobile Station Test Set combined with an Agilent
83236B Cellular Adapter can be used to simulate a high performance
CDMA base station and may be useful in attempting to duplicate the
problem.
Refer to following table to determine which diagnostic tests,
performance tests, and periodic self calibration adjustments apply to an
assembly. Downloading calibration data is discussed in Chapter 7 ,
“Periodic Adjustments,” on page 157.
Table 3-2
Relating Assemblies to Troubleshooting Aids
SERVICE4
Program
Diagnostic Test:
Sub-Test
Performance
Periodic
Cal.-Data
Test to Perform1
Calibration2
Program
Needed3
Ref.
Designator
Assembly Name
A1A2
Keypad
A1A1
Display
A2A200
100W Attenuator
Functional
Diagnostics:
RF Modules
A2A130
RF Input/Output
RF Diagnostics:
RF Input/Output
A2A34
Data Buffer
Functional
Diagnostics: CDMA
Loopback
A2A110
Upconverter
RF Diagnostics:
Upconverter
A1A2
RPG Assembly
No
A1
Front Panel
No
A2A36
Receive DSP
A2A10
PCMCIA
Functional
Diagnostics: Self
Test
No
No
Functional
Diagnostics: CDMA
Loopback
RF Generator:
Level Accuracy
PCMCIA Program
System Power
E6380-61811
Yes
PCMCIA Program
System Power
E6380-61811
Yes
SERVICE4: IQ
Modulator, Eb/No
Yes
Yes
No
No
Chapter 3
75
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Table 3-2
Relating Assemblies to Troubleshooting Aids
Ref.
Designator
Assembly Name
SERVICE4
Program
Diagnostic Test:
Sub-Test
Performance
Periodic
Cal.-Data
Test to Perform1
Calibration2
Program
Needed3
A2A32
Signaling
Source/Analyzer
AF Diagnostics:
Audio
Frequency
Generators 1 and 2
No
A2A31
Controller
Functional
Diagnostics: Self
Test
Yes
A2A30
Memory/SBRC
Functional
Diagnostics: Self
Test
No
A2A115
Downconverter
RF Diagnostics:
Downconverter
Yes
A3A1
Power Supply
Regulator
Functional
Diagnostics: Self
Test
No
A21
Fan
A2A50
Display Drive
Functional
Diagnostics: Self
Test
No
A23
Power
Supply
Functional
Diagnostics: Self
Test
No
A2A25
Signal
Generator
Synthesizer
RF Diagnostics:
Signal Generator
Synthesizer
A2A120
LO-IF/IQ Modulator
CDMA Diagnostics
LO_IF/IQ Mod.
A2A24
RF Output
RF Diagnostics:
Output
A2A23
Reference
RF Diagnostics:
Reference
RF Generator:
Residual FM
Yes
A2A22
Receiver
Synthesizer
RF Diagnostics:
Receiver
Synthesizer
RF Analyzer:
Residual FM
Yes
A2A100
CDMA Generator
Reference
CDMA Diagnostics:
CDMA Gen. Ref.
A2A21
Receiver
RF Diagnostics:
Receiver
A3
Power Supply
No
76
RF Generator:
Harmonic and
Spurious Spectral
Purity
Yes
SERVICE4:
IQ Modulator,
Eb/No
Yes
Yes
SERVICE4:
IQ Modulator,
Eb/No
RF Analyzer:
FM Accuracy
Yes
Yes
No
Chapter 3
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Table 3-2
Relating Assemblies to Troubleshooting Aids
Ref.
Designator
Assembly Name
SERVICE4
Program
Diagnostic Test:
Sub-Test
Performance
Periodic
Cal.-Data
Test to Perform1
Calibration2
Program
Needed3
A2A20
Spectrum
Analyzer
RF Diagnostics:
Spectrum Analyzer
Spectrum Analyzer
A2A70
Control
Interface
Functional
Diagnostics: Self
Test
A2A44
Modulation
Distribution
AF Diagnostics:
Mod
Distribution
Internal Paths
A2A80
Audio
Analyzer 1
AF Diagnostics:
Audio Analyzer 1
Internal Paths
A2A40
Audio
Analyzer 2
AF Diagnostics:
Audio
Analyzer 2
A2A33
Measurement 4
Functional
Diagnostics: Self
Test
A2A1
Motherboard
1.
2.
3.
4.
Yes
No
SERVICE4:
Periodic
Calibration:
AF Gen Gain,
EXT Mod Path
Gain
Yes
SERVICE4:
Periodic
Calibration:
Audio Analyzer
Offset
Yes
AF Analyzer:
AC Voltage
Accuracy
SERVICE4:
Periodic
Calibration:
VFN
Yes
Oscilloscope
SERVICE4:
Periodic
Calibration:
Voltmeter
Reference
Yes
AF Generator: AC
Level Accuracy
No
See Chapter 4 , “Preventative Maintenance,” on page 93.
SeeChapter 7 , "Periodic Adjustments" on page 157.
See Table 7-1 on page 159.
Measurement checked indirectly by all diagnostics.
Chapter 3
77
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Verify Test Set’s Reference Path
Out-of-Lock (OOL) LEDs
Out-of-lock (OOL) LEDs light when a phase-locked loop inside an
assembly is failing. The Signal Generator Synthesizer, A2A25, and the
Receiver Synthesizer, A2A22, assemblies have these LEDs mounted
close to the top of the modules. The location of each LED is labeled on
the assembly.
Verify that the CDMA Generator Reference (A2A100) and the
Reference (A2A23) are working before troubleshooting the Receiver
Synthesizer (A2A22) and/or the Signal Generator Synthesizer (A2A25)
assemblies.
Figure 3-16
J78
J76
J75
A2A22
A2A23
SIG GEN SYNTH A2A25
RCVR SYNTH
REFERENCE
J3
Out-of-Lock LEDs
OOLs.eps
CDMA Generator Reference (A2A100) Verification
• Verify that a 1, 2, 5, or 10 MHz signal of >0.15 Vrms is being applied
to the EXT REF IN connector.
• Verify that the 10 MHz REF OUT connector, outputs a 10 MHz
signal of >0.5 Vrms.
78
Chapter 3
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Figure 3-17
Simplified Reference Path Block Diagram
Receiver
Synth
CDMA
Reference
Generator
Reference
EXT REF IN
10 MHz REF OUT
Signal Generator
Synthesizer
If the 10 MHz signal is present, then this verifies the reference path
through the CDMA Generator Reference and the Reference (A2A22)
assemblies.
NOTE
There are other functions on these assemblies that are NOT verified.
CDMA Generator Reference (A2A100) Assembly Verification
1. Turn the Test Set off and remove the external cover.
2. Remove the bottom cover and verify that the cable is connected
between the EXT REF IN connector and J17 on the CDMA
Generator Reference assembly.
3. Turn the Test Set on and verify that a 10 MHz signal is present on
J15 of the CDMA Generator Reference assembly.
If no signal or a poor signal appears at this connector, then the
CDMA Generator Reference assembly is faulty.
4. Turn the Test Set off and remove the top covers.
5. Use screwdrivers to remove the Reference assembly.
6. Turn the Test Set on and verify that a 10 MHz signal is present on
pin 20 of J63 and pin 19 of J18. This is the reference signal from the
CDMA Generator Reference (A2A100) assembly.
If the 10 MHz signal is not present at all, then the CDMA Generator
Reference (A2A100) assembly is faulty.
If the signal is present on pin 20 but not pin 19, then the Motherboard
(A2A1) assembly is faulty (open or short).
Chapter 3
79
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Reference, A2A23, Verification
1. Turn the Test Set off and re-install the Reference assembly.
2. Use screwdrivers to remove the Receiver Synthesizer (A2A22)
assembly.
3. Turn the Test Set on and verify that a 1 MHz signal of
approximately −1 dBm is present on pin 3 of J21. This is the
reference signal from the Reference assembly.
4. If the 1 MHz signal is not present, then the Reference assembly is
probably faulty.
It is also possible that an open or shorted trace on the motherboard
assembly exists. Check the motherboard for continuity between J21 pin
3 under the Receiver Synthesizer A2A22 assembly and J18 pin 2 under
the Reference assembly, and verify that the trace is not shorted to
ground.
Receiver Synthesizer, A2A22, Unlocked
If the 1 MHz signal is present on pin 3 of J21, then the Receiver
Synthesizer assembly is faulty.
Signal Generator Synthesizer, A2A25, Unlocked
1. Turn the Test Set off and use screwdrivers to remove the Signal
Generator Synthesizer assembly.
2. If the signal is present, then the Signal Generator Synthesizer
assembly is faulty.
3. Turn the Test Set on and verify that a 1 MHz signal of about −20
dBm is present on pin 3 of J12. This is the reference signal from the
Reference (A2A23) assembly.
If the 1 MHz signal is not present, then the Reference (A2A23)
assembly is probably faulty.
It is also possible that an open or shorted trace on the Motherboard
(A2A1) assembly exists. Check the motherboard for continuity between
J12 pin 3 (under the Signal Generator Synthesizer assembly) and J34
pin 1 (under the Reference, A2A23, assembly), and verify that the trace
is not shorted to ground.
80
Chapter 3
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Swapping Known-Good Assemblies
Most swapped assemblies which use calibration data will operate well
enough with the original assembly’s calibration data to troubleshoot
and to run the diagnostics; do not expect the Test Set to meet its
specifications. Some assemblies may appear to fail because of incorrect
calibration data. It is also important to keep track of the original
assemblies in the Test Set. If calibration data is lost, the assembly will
have to be sent back to the factory.
Calibration data is generally stored in a socketed EEPROM on the
A2A31 Controller. If the controller is replaced or swapped, the original
EEPROM must be put in the new Test Set’s Controller. Should the
EEPROM lose its data, the entire instrument will require a factory
recuperation.
The assemblies that require downloaded calibration data from a
memory card are:
• A2A20 Spectrum Analyzer
• A2A33 Measurement
• A2A200 100W Attenuator
Swapping these assemblies may cause some performance specification
failures if the swapped in assembly's calibration data cannot be
downloaded.
The assemblies that require on-board calibration loaded at the factory
are:
• A2A115 Downconverter
• A2A110 Upconverter
• A2A130 RF Input/Output
• A2A44 Output Section
• A2A21 Receiver
• A2A25 Signal Generator Synthesizer
• A2A22 Receiver Synthesizer
• A2A23 Reference
Swapping these assemblies should not cause a performance problem, as
their calibration data resides with the assembly.
Chapter 3
81
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
The assemblies that require a periodic calibration procedure are:
• A2A100 CDMA Generator Reference
• A2A130 RF Input/Output
• A2A120 LO IF/IQ Modulator
• A2A200 100W Attenuator
• A2A34 Data Buffer
• A2A80 Audio Analyzer 1
• A2A40 Audio Analyzer 2
• A2A33 Measurement
• A2A44 Modulation Distribution
Generally, these assemblies can be swapped without an immediate need
of recalibration. In some cases though, a recalibration may be necessary
to properly troubleshoot the instrument.
Further Isolating RF Failures
Isolating failures in the RF assemblies of the Test Set can be difficult.
One problem occurs when the diagnostics use the built-in RF analyzer
to test the built-in RF source, and vice versa. This is necessary to make
the diagnostics self-contained, that is, they run without external
equipment.
Some general-purpose, RF test equipment will be needed:
• RF signal generator
• RF modulation analyzer or spectrum analyzer.
Isolating the RF Analyzer
The RF Analyzer function uses the following assemblies. Refer to
Figure 3-18 on page 83 and the block diagrams in Chapter 10 , “Block
Diagrams,” on page 283.
• A2A115 Downconverter
• A2A21 Receiver
• A2A22 Receiver Synthesizer
• A2A20 Spectrum Analyzer
82
Chapter 3
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
Figure 3-18
ANT
IN
Isolating the RF Analyzer
Input
Attenuator
OPP
Down
Conversion
Receiver &
IF
Receiver
Synthesizer
Demod
(FM, AM, SSB)
Spectrum
Analyzer
Power
Detector
RF
IN/OUT
100 W
Attenuator
Splitter
RF Analyzer
DUPLEX
OUT
RPP
Output
Attenuator
Reference
RF I/O
FROM RF SOURCE
To isolate an RF analyzer problem:
1. On the Test Set:
a. Press Preset.
b. Press the Inst Config to access the INSTRUMENT CONFIGURE
screen.
• Set the RF Display field to Freq.
• Set the RF Offset field to Off.
c. Press the RF Anl key (to go to the analog RF ANALYZER screen).
• Set the Tune Freq to 100 MHz.
• Set the Input Port to RF IN.
2. On the external RF signal generator:
a. Set the frequency to 100 MHz CW.
b. Set the amplitude to 0 dBm.
c. Connect the output to the Test Set’s RF IN/OUT connector.
Chapter 3
83
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
3. Set the RF signal generator’s frequency to 100, then 500, 900, and
1800 MHz. For each frequency reset the Tune Freq to that
frequency. The Test Set’s measurements should read as follows:
a. TX Power should read approximately 0.001 W for each frequency.
b. Frequency should read 100, 500, 900, and 1800 MHz respectively.
c. Press the Spec Anl key to access the analog spectrum analyzer.
Observe the level and frequency of the signal.
Isolating the RF Source
The RF Generator function uses the following assemblies. Refer to
Figure 3-19 and the block diagrams in Chapter 10 , “Block Diagrams,”
on page 283.
• A2A120 LO IF/IQ Modulator
• A2A25 Signal Generator Synthesizer
• A2A24 Output Section
• A2A110 Upconverter
Figure 3-19
ANT
IN
Isolating the RF Source
Input
Attenuator
OPP
TO RF ANALYZER
DC Block
Reference
Power
Detector
RF
IN/OUT
100 W
Attenuator
DUPLEX
OUT
Splitter
RPP
Output
Attenuator
RF I/O
Up
Converter
Output
Section
IQ
Modulator
Sig Gen
Synthesizer
RF Generator
84
Chapter 3
Troubleshooting
Manual Troubleshooting Procedures (Step 4)
To isolate the RF Source:
1. On the Test Set:
a. Press Preset.
b. Press the Inst Config key to access the INSTRUMENT
CONFIGURE screen.
• Set the RF Display field to Freq.
• Set the RF Offset field to Off.
c. Press the RF Gen key (to go to the analog RF GENERATOR
screen).
d. Set RF Gen Freq to 1800 MHz.
e. Set Amplitude to 0 dBm.
f. Set Output Port to Dupl.
2. On the external RF modulation analyzer or spectrum analyzer:
a. Set the tuning for the signal generated by the Test Set.
b. Connect the analyzer’s input to the Test Set’s DUPLEX OUT
connector.
3. Set the Test Set’s RF Gen Freq to 1800, then 600, 300, and 150 MHz.
For each frequency, the external RF analyzer should read as follows:
a. Power should read approximately 0.001 W for each frequency.
b. Frequency should read 1800, 600, 300, and 150 MHz respectively.
Chapter 3
85
Troubleshooting
Service Screen
Service Screen
A large number of latch and DAC settings used throughout the Test Set
can also be read and/or set to alter standard operation. The Service
screen uses the internal voltmeter and frequency counter functions to
monitor specific nodes in most assemblies. These functions are
primarily intended to allow the automated internal diagnostic routines
to verify proper instrument operation, and to allow the internal periodic
adjustment routines to modify Test Set operation.
Use these functions for further troubleshooting when the diagnostics
cannot isolate a failure to a specific assembly. To do this, you must
understand how to operate the Test Set and, especially, understand how
the assemblies in the Test Set work together.
How to Access the SERVICE Screen
1. Press the Preset key.
2. Rotate the knob to the screen’s title bar and select it (press knob). A
drop down menu appears, see Figure 3-20.
Figure 3-20
Service Screen
SOFTWARE MENU Screen
SOFTWARE
MENU
SOFTWARE
SOFTWAREMENU
MENU
CDMA GENERATOR
CODE DOMAIN ANALYZER
SPECTRUM ANALYZER
OSCILLOSCOPE
SOFTWARE MENU
LOAD TEST PROCEDURE:
ANALYZER
Select Procedure RF
Location:
RF GENERATOR
ROM
AF ANALYZER
CONFIGURE
Select Procedure INSTRUMENT
Filename: Library:
I/O CONFIGURE
SERVICE4
[NO LIB]
PRINTER CONFIGURE
ERROR MESSAGE
SERVICE
Description:
HELP
1 Run Test
2 Continue
Program:
ROM
Launches disgnostic and calibration programs.
CUSTOMIZE TEST PROCEDURE:
Freq Channel Information
Parm Test Parameters
Seqn Order of Tests
Spec Pass/Fail Limits
Proc Save/Delete Procedure
4 Help
SET UP TEST SET:
Exec Execution Cond
Cnfg
External Devices
Print
Printerservsrn1.eps
Setup
IBASIC IBASIC Cntrl
SERVICE Screen
SERVICE
Voltage
V
Frequency
kHz
Voltmeter Connection
RFIO_DIAG_0
Counter Connection
AUD1_COUNT
Gate Time
50.0
ms
Latch
sgnl_revision
value
19950310
hex
RAM Initialize
Clear all RAM and restart
service1.eps
86
Chapter 3
Troubleshooting
Service Screen
3. Rotate the knob and select SERVICE.
The SERVICE screen appears. For field descriptions, see “Field Names
and Descriptions” on page 87.
Field Names and Descriptions
Voltmeter Connection
This field selects the desired circuit node for voltage measurements. To
change the voltmeter connection, use the knob to select the Voltmeter
Connection field. A Choices menu will appear. Move the cursor to the
desired circuit node in the list and push the cursor control knob. The
reading is displayed in the Voltage measurement field at the top- left
of the display.
Because the nodes being measured must be in the range of 0 to ±5 volts,
the measurement of some points are scaled to that measurement range.
For example; the +12 Volt reference (MEAS_12V_REF) should measure
about +5volts. The −12 Volt reference (MEAS_NEG_12V_REF) should
measure about −5 volts. Many of the voltage measurements are only
valid after a number of instrument settings are changed.
When run, the diagnostic routines make the necessary circuit changes
and measurements automatically, comparing the measurements to
known limits for each node.
Counter Connection
This field selects the desired circuit node to connect to the Test Set’s
internal frequency counter. The reading is displayed in the Frequency
measurement field at the top right of the display.
To change the counter connection, use the knob to select the Counter
Connection field. A Choices menu will appear. Select the desired
circuit node.
Gate Time
This field is used to adjust the Test Set’s internal frequency counter’s
gate time. A shorter gate time may enable you to see frequency
fluctuations that might not be seen using a longer gate time.
To change the gate time, use the knob to select the Gate Time field.
When you select the field a flashing >> cursor is displayed. Rotate the
cursor control knob until the desired gate time (10 to 1000 ms in 10 ms
increments) is displayed, then press the cursor control knob.
Chapter 3
87
Troubleshooting
Service Screen
Latch
This field is used to manually select the circuit latches that control
switch, DAC, and gain settings within the Test Set. The value of the
selected latch is displayed and changed in the Value field. Some
settings are read-only.
To set a switch, DAC, or gain setting:
1. Use the knob to select the Latch field. A Choices menu will appear.
2. Move the cursor to the desired latch name and press the knob to
select it.
3. Use the knob to select the Value field. A flashing >> cursor is
displayed.
4. Rotate the cursor control knob to modify the value (hexadecimal).
NOTE
If any of the switches, DACs, or gain settings are changed with the
Latch field, the Test Set will generate the message: Direct latch
write occurred. Cycle power when done servicing.” To clear this
message, cycle the Test Set’s power. Upon power-up, the internal
controller will return the Test Set to its default settings and values.
88
Chapter 3
Troubleshooting
Service Screen
The first part of the names in the Choices menu relates to the
assembly where the switch, DAC, or gain setting is located. Some latch
names are not listed here.
• dstr: A2A44 Modulation Distribution
• aud1: A2A80 Audio Analyzer 1
• aud2: A2A40 Audio Analyzer 2
• refs: A2A23 Reference
• rfio: A2A130 RF Input/Output
• dcvt: A2A115 Downconverter
• ucvt: A2A110 Upconverter
• out: A2A24 Output Section
• rcvr: A2A21 Receiver
• gsyn: A2A25 Signal Generator Synthesizer
• rsyn: A2A22 Receiver Synthesizer
• spec: A2A20 Spectrum Analyzer
• genRef: A2A100 CDMA Generator Reference
• genRef2: A2A100 CDMA Generator Reference
• lo_if: A2A120 LO IF/IQ Modulator
• meas: A2A33 Measurement
• metron: A2A33 Measurement
• afg1: A2A32 Signaling Source/Analyzer
• afg2: A2A32 Signaling Source/Analyzer
• buffModN: A2A34 Data Buffer
Value (hex)
This field displays and changes the hexadecimal value for the latch
shown in the Latch field.
RAM Initialize
Selecting this field clears all SAVE registers and test programs, and
any initialized RAM disk(s), that may be in RAM. It also resets all
latches to their factory power-up configuration. If you have saved one or
more instrument setups using the SAVE function, using this function
will permanently remove them.
Chapter 3
89
Troubleshooting
Product Verification
Product Verification
This section provides steps for verifying the Test Set’s operation after a
repair. Although in most cases this will be sufficient, this does not verify
the ability of the instruments to meet CDMA Cellular/PCS Base
Station specifications. Only by performing all of the Performance Tests
in Chapter 8 , “Performance Tests,” on page 173 can you verify the
instrument’s performance. The following steps are suggested, you may
choose to do more.
1. Run the Functional Diagnostics test of the SERVICE MENU
(SERVICE4 program), see figure 3-21. The Functional Diagnostics
tests verify the function of most of the assemblies in the Test Set.
Figure 3-21
Functional Diagnostics
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
Move the pointer to the desired test using the
knob then press the knob. Press Serv Menu to
go to the Service Menu, Exit key to abort.
2
3
4 Help
1
5 Exit
2
3
Functional
Diagnostics
Screen
=> RF Modules
Analog Modulation
CDMA Loopback
Self Test
Power Supplies
4 Sev Menu
5 Exit
funcscrn.eps
90
Chapter 3
Troubleshooting
Product Verification
2. Perform a wideband sweep:
a. Press Preset then press Spec Anal to get the SPECTRUM
ANALYZER screen.
b. Set the RF Gen controls to Track, and the Port/Sweep field to
Dupl. This directs the tracking generator to the DUPLEX OUT
port.
c. Connect the DUPLEX OUT port to the ANT IN port.
d. Set the Main control to Ant.
e. Set the Center Freq to 501 MHz, and the Span to 1 GHz. You
should see a (roughly) flat line across the screen, varying about
4 dB. “Generator sweep truncated” may appear, but does not
indicate a problem.
3. Run the Performance Tests associated with the repair as indicated in
Table 3-2 on page 75, or run all the tests in Chapter 8 , “Performance
Tests,” on page 173 to verify that the Test Set meets its overall
performance specifications.
Chapter 3
91
Troubleshooting
Product Verification
92
Chapter 3
4
Preventative Maintenance
This chapter describes the preventative maintenance procedures
recommended for the Test Set.
93
Preventative Maintenance
Hardware Maintenance
Hardware Maintenance
The following procedures should be performed on a regular basis to
insure that your Test Set maintains optimum performance.
NOTE
Periodic Adjustment Interval
The adjustment programs Periodic Calibration, IQ Calibration, and
Eb/No Calibration should be performed after any assembly referred to
in Table 7-1 on page 159 is replaced, or at least every 24 months. These
program can be run anytime to optimize the performance of the Test
Set. See Chapter 7 , “Periodic Adjustments,” on page 157 for details.
NOTE
Performance Test Interval
The performance tests in Chapter 8 , “Performance Tests,” on page 173
should be performed when certain assemblies are repaired or replaced,
or at least every 24 months. See Table 3-2 on page 75 for those
assemblies requiring performance testing/calibration.
Adjustments
• Periodic Adjustments
Adjustments for calibration are part of the automated routines:
Periodic Calibration, IQ Calibration, and Eb/No Calibration. To run
these routines see “Running the Periodic, IQ, or Eb/No Calibration
Programs” on page 163. Running these routines will adjust internal
calibration and circuit paths for optimum performance. These
routines can be run on any interval from six months to two years,
depending on the severity of the application environment. These
routines should also be run whenever a significant change to
instrument’s hardware configuration is made. For instructions on
running the periodic adjustment routines see Chapter 7 , “Periodic
Adjustments,” on page 157.
94
Chapter 4
Preventative Maintenance
Hardware Maintenance
• Real Time Clock
The Test Set operates with a real-time clock that is user set. The
real-time clock consists of both a numerical date and a time-of-day
setting which may require changing due to repair (such as a battery
or hardware repair) or shipping to a different time zone. The clock
and date should be checked as part of routine maintenance. Incorrect
settings may be an indication of faulty battery backup.
The date and time settings are entered by using the INSTRUMENT
CONFIGURE screen. The Date field is a numerical number using
the MMDDYY format. The Time field is a numerical number using a
24-hour military standard (example: 3:00 pm is 15.00 in military
time). The date and time are maintained as part of RAM memory
with battery backup.
Cleaning
• The Test Set contains an internal air filter. The filter requires
periodic cleaning to remove dust and debris. Refer to “Cleaning the
Air Filter” on page 97.
• RF assemblies A2A20 through A2A25 (see Figure 5-8 on page 113)
should be removed and the bottom edges of the metal case cleaned
with isopropyl alcohol or a mild cleaner. Cleaning the metal edges
will insure that RF leakage protection is maintained.
Functionality
The Test Set has the capability to perform self tests for hardware
failure and functionality. The self test diagnostics should be run
whenever preventive maintenance, calibration, or repair has been
performed. Self test diagnostics will help to insure that the instrument
is performing reliably.
There are three diagnostic routines located in ROM of the Test Set:
Functional Diagnostics, AF Diagnostics, and RF Diagnostics. Run these
programs and follow the instructions listed on the screen. For
instructions on running these diagnostics routines, see “Accessing the
Diagnostic Tests” on page 62.
Chapter 4
95
Preventative Maintenance
Hardware Maintenance
Integrity
The Test Set has been designed for rugged conditions, however parts
can become loose or damaged over time and may require repair or
maintenance.
• Module Insertion and Alignment
The Test set contains circuit assemblies and RF modules that are
mounted in sockets and board guides. It is extremely important that
these assemblies be firmly seated and aligned in their guides.
Remove the Test Set’s cover and check that boards align with the
printed guides on the internal sheet metal covers. Ensure that each
of the six RF module cases are firmly seated and locked in with their
module bracket(s).
• Type-N Connectors
The Test Set’s RF IN/OUT, ANT IN, and DUPLEX OUT connectors
should be checked for damage or looseness. Damage can occur to the
center conductor pin or the connector itself might become loosened.
If damaged, the connector should be replaced. A loose connector can
be re-tightened with the nut on the back side of the side panel. Refer
to Chapter 5 , “Disassembly,” on page 101 for information on the
side-panel connectors.
• Internal Cables and RF Connectors
The Test Set contains numerous cables and connectors that should
be periodically checked for proper insertion and tightness. Remove
the Test Set’s cover and visually check for any cables that may not be
properly inserted. Check each RF cable connection for tightness,
tighten where needed. Refer to Chapter 5 , “Disassembly,” on page
101 for information on the various cables and assemblies.
96
Chapter 4
Preventative Maintenance
Maintenance Procedures
Maintenance Procedures
Cleaning the Air Filter
NOTE
The cleaning interval is dependent on the environmental conditions
and application, it can be as often as six months in extremely dusty or
dirty environments or as long as two years in a clean, well maintained
facility.
The Test Set’s internal air filter requires periodic cleaning. Failure to
periodically clean this filter may result in decreased internal airflow,
increased internal operating temperature, and early failure of the Test
Set.
1. Remove the front frame and external cover to access the air filter,
see Figure 4-1 on page 99. It is not necessary to remove the rear
frame. Refer to Chapter 5 , “Disassembly,” on page 101 for removing
the front frame and external cover.
2. Lift the filter from the Test Set’s chassis. Use a vacuum to clean the
filter. Use only a static-free vacuum cleaner or ionized air for the
removal of dust and debris.
Memory Backup AA Battery
Two battery sources are used to maintain the contents of the Test Set’s
memory when power is disrupted. One source is a set of two AA
batteries mounted behind the rear frame of the Test Set. You must
periodically change these batteries. The second battery source acts as a
backup to the AA batteries. It is internally mounted and is not user
serviceable.
CAUTION
Replace these batteries every 2-3 years. Failure to take prompt action
may result in loss of RAM data including IBASIC programs and
SAVE/RECALL states stored in the RAM.
Chapter 4
97
Preventative Maintenance
Maintenance Procedures
To change the AA batteries, use the following procedure:
1. Switch power off and unplug the Test Set.
2. Remove the six TX-15 torx screws in the rear frame, see Figure 4-1
on page 99. It is not necessary to remove the front frame or external
cover.
3. Remove the rear frame.
4. Replace the AA batteries. Do not use rechargeable batteries, and
dispose the used batteries properly.
5. Re-install the rear frame.
Reset and GFI-Test Buttons
(older units with GFI circuit)
1. Remove the rear frame. It is not necessary to remove the front frame
or external cover.
2. To reset the Test Set, press the black button. To test the ground fault
interrupter, press the red button.
3. Re-install the rear frame.
98
Chapter 4
Preventative Maintenance
Maintenance Procedures
Figure 4-1
AA Batteries, Air Filter, and GFI Reset/Test Buttons
Rear Frame
Screws (x6)
Air Filter
Chassis Rear View
Vent
AA Battery
aabat1.eps
GFI Test (Red)
Button
Reset (Black)
Button
PC Card Battery
CAUTION
BEFORE REMOVING THE BATTERY from the PC card, insert the
card into a powered-up Test Set. Removing the battery without an
alternate power source will destroy the data in the card.
External PC card (PCMCIA) contain batteries which require
replacement. These batteries should be replaced every 12 months or
whenever signs of lost data are noted. See Figure 4-2 for battery
replacement.
Chapter 4
99
Preventative Maintenance
Maintenance Procedures
Figure 4-2
PCMCIA Card Battery Replacement
Battery Holder Lock
Locked
Unlocked
Read Only
Write
Write Protect Switch
Battery Holder
Battery
Battery Holder
CAUTION: INSERT CARD INTO A POWERED-UP
TEST SET BEFORE REMOVING BATTERY.
changbat.eps
100
Chapter 4
5
Disassembly
This chapter explains how to disassemble the Test Set for major
assembly replacement.
101
Disassembly
Service Tools
Service Tools
Tools
One or more of the following tools may be required to access and/or
remove various internal assemblies in the Test Set:
• TX-10 torx screwdriver
• TX-15 torx screwdriver
• Flat blade screwdriver
• 1/16-inch allen wrench
• 3/16-inch socket wrench
• 5/16-inch open-end wrench (for SMC connectors)
• 15/64-inch open-end wrench (for SMA connectors)
• 9/16-inch open-end wrench (for BNC connectors)
• 3/4-inch open-end wrench (for Type-N connectors)
Recommended Torque
• Tighten screws until snug. Overtightening can strip screws.
• SMA (RF) connectors: 9.0 lb-in. (102 N-cm)
• SMC (RF) connectors: 6.0 lb-in. (68 N-cm)
• Nuts holding semi-rigid coax to motherboard: 6.0 lb-in. (68 N-cm)
102
Chapter 5
Disassembly
Assembly Replacements
Assembly Replacements
With some assemblies you will receive a memory card that contains
factory-generated calibration data for that assembly. For new
replacements, there will also be an instruction sheet for loading the
calibration data into your Test Set.
External equipment is not required for running the diagnostic routines.
If diagnostic routines cannot isolate the problem, an oscilloscope,
voltmeter, and spectrum analyzer may be required for further
troubleshooting. A second Test Set is helpful for troubleshooting
performance test failures.
Table 3-2 on page 75 and Table 7-1 on page 159 show which assemblies
need calibration data as well as which performance tests and periodic
self-calibration adjustments are recommended after replacing an
assembly.
NOTE
Periodic Adjustment Intervals
The adjustment programs Periodic Calibration, IQ Calibration, and
Eb/No Calibration should be performed after any assembly referred to
in Table 7-1 on page 159 is replaced, or at least every 24 months. These
program can be run anytime to optimize the performance of the Test
Set. See Chapter 7 , “Periodic Adjustments,” on page 157 for details.
NOTE
Performance Test Intervals
The performance tests in Chapter 8 , “Performance Tests,” on page 173
should be performed when certain assemblies are repaired or replaced,
or at least every 24 months. See Table 3-2 on page 75 for those
assemblies requiring performance testing/calibration.
Replacement Parts
For replacement part numbers, see Chapter 6 , “Replaceable Parts,” on
page 135. For cable routing information refer to Table 5-2 on page 130.
Chapter 5
103
Disassembly
Removing the External and Internal Covers
Removing the External and Internal Covers
To access most of the components inside the Test Set, you must remove
the front frame, external cover, and internal covers (see Figure 5-1 and
Figure 5-2). It is not necessary to remove the side panel or rear frames
in most cases. You must remove the rear frame to access the memory
AA backup-batteries, power supply assemblies, or to test and/or reset
the ground fault interrupter (GFI).
External Covers
1. To remove the front frame, remove the eight screws securing it and
pull it away from the chassis, see Figure 5-1.
2. After removing the front frame, remove the external cover by sliding
it slightly forward and away from the chassis.
3. To access the backup batteries, power supply, or GFI, remove the
rear frame by removing the 6 screws securing it to the chassis. Pull
the rear frame away from the chassis.
4. To remove the side panel frame, remove the handle and eight screws
securing this frame to the chassis.
Figure 5-1
External Cover Removal
Rear Frame
External Cover
Screws (x6)
k1©
k1
Front Frame
k2©
Men
k2
u
Rese
k3©
t
Paus
k3
CDM
Cone/
tinu
Gen
A
e
CDM
k4©
Ref
Incr
A
Gen
Set
10
k5
Anl
RF
k4
AF
Mete
Incr r
Rele
ase
Code
Anl
Dom
RF
Set
Anl
Avg
Incr
Lo
Scop
x 10
Limit
Spec
7
Shif
Shif
t
t
Hi
Pus
Screws (x8)
h
to
ect
4
r
5
1
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el
ll
dB
GHz
C
dBm
2
D
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3
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limit
0
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%
MHz
V
+/-
Yes
On/O
ff
No
Prev
s
kHz
mV
ppm
W
Print
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Conf
Printig
ms
%D
dBµV
I/O
mW
Hz
µV
Conf
Inst ig
Conf
ig
Erro
r
Mes
Helpsage
Side Panel Frame
Handle
Screws (x8)
Impact Cover
extcvrs3.eps
104
Chapter 5
Disassembly
Removing the External and Internal Covers
Internal Covers
There are internal covers protecting the top- and bottom-side
assemblies of the Test Set. To remove the top covers, see Figure 5-2
below. To remove the bottom cover, see “Bottom Internal Cover” on page
108.
Top Internal Covers
1. Remove the front frame and external cover, see “External Covers” on
page 104. Side panel and rear frame removal is not necessary.
2. To access the top-side assemblies, remove the MP13 and MP12
internal covers by removing the screws securing these covers to the
chassis, Figure 5-2.
3. Lift the MP14 cover to access the PCB assemblies.
Refer to Figure 5-3 on page 107 to help you identify the assemblies and
components in the Test Set.
Chapter 5
105
Disassembly
Removing the External and Internal Covers
Figure 5-2
Top Internal Covers
Screws (x17)
MP12
Cover-Top
Screws (x14)
MP13
Cover-Mod
MP14
Cover-Digital
intcvr3.eps
k1
©
k1
k2
©
Me
k2
k3
k4
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CD
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4
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106
Chapter 5
Disassembly
Removing the External and Internal Covers
Figure 5-3
Topside View of Test Set
A3
Assembly
MOD. DISTRIBUTION, A2A44
6kHz BP
A2A80A2
AUDIO 2, A2A40
C-MSSG
A2A80A1
AUDIO 1, A2A80
CONTROL INTERFACE
A2A70
MOTHERBOARD A2A1
RECEIVE DSP, A2A36
W204
DATA BUFFER, A2A34
C
MEASUREMENT, A2A33
D
SIGNAL SOURCE, A2A32
F
D. DRIVE, A2A50
A B
MEMORY (SBRC), A2A30
E
CONTROLLER, A2A31
W205
A2
J4
SIG GEN SYNTH A2A25
RF OUPUT A2A24
REFERENCE A2A23
RCVR SYNTH A2A22
J59
RECEIVER A2A21
W201
SPEC ANALYZER A2A20
MOTHERBOARD A2A1
J8 J36 J37 J38 J9 J39 J11
Assembly
J3
PCMCIA
A2A10
A1
Assembly
Display
A1A1
Speaker
A1LS1
Chapter 5
RPG
A1A3
Keypad
A1A2
a2ovrvw1.eps
107
Disassembly
Removing the External and Internal Covers
Bottom Internal Cover
To access the assemblies on the bottom side of the Test Set, turn the
Test Set over, remove the screws shown in Figure 5-4, and lift the
bottom internal cover from the chassis.
CAUTION
If the top covers are off, be careful. The exposed digital boards can be
easily damaged. Some of the digital boards have pull-rings that can
easily get hooked and pull assemblies from their connections.
Use Figure 5-5 on page 109 to identify the assemblies on the bottom
side of the Test Set.
Figure 5-4
Bottom Internal Cover
Screws (x27)
MP15
Cover-Bottom
intcvr1.eps
108
Chapter 5
Disassembly
Removing the External and Internal Covers
Figure 5-5
Bottom View of Test Set (without Bottom Cover)
A2J1
W1 W2 W3
W4
W5 W6
W7
W8 W9 W10
A2J2 A2J3
W12
W11
W11 W12 W13 W14
RED BLU WHT GRY
W54
YEL
W15
PRL
W55 W58
BLK RED
W16 W17
ORG GRN
W14
W13
A2P1
A2P2
A2P1
A2P2
A2P3
A2P2
A2J4
W16
W15
W17
W101
W61
BLU
A1
J17
J15
J16
A2A110
Assembly
W210
W100
W24
A2
J9
J11
J13
J14
J12
J10
J7
J5
J6
J8
W53 BRN
J1
J2
W121
W62 GRY
A2A130
Assembly
W122
W56 GRY
W57 ORG
W63 YEL
W64 GRN
W110
W61 BLU
A2A120
Assembly
W53 BRN "A"
W54 YEL "B"
W122
W120
W121
B
A
W213
W213
LO/IF Section
W213
E
D
W55 BLK "F"
W52 GRY "E"
W51 WHT "D"
C
W50 BLK "C"
W110
I/Q Section
F
W211
W64 GRN
W52
W51 WHT
A2
A2A130
Assembly
J3
W50 BLK
W63 YEL
W58 RED
W212
A2A115
Assembly
W57 ORG
W56 GRY
W120
W123
A3
a2btmvw3.eps
Chapter 5
109
Disassembly
A1 Disassembly
A1 Disassembly
1. Remove the front frame, external cover, and internal top and bottom
covers, see “Removing the External and Internal Covers” on page
104.
2. Remove the eight screws securing the A1 assembly to the A2
assembly, see Figure 5-6.
3. Disconnect cables W200 and W202 from connectors J79 and J49 on
the A2A1 motherboard.
To replace a component or subassembly on the A1 assembly, see Figure
5-7 on page 111.
Figure 5-6
A1 Assembly
MP103 (x8)
A1 Assembly
J1
A2 Assembly
J5
J2
J5
W200
W202
J49
J79
Motherboard
a1dis1.eps
110
Chapter 5
Disassembly
A1 Disassembly
Figure 5-7
A1 Assemblies and Components
Keypad A1A2
(sheet metal frame included)
Screen MP35
Frame MP34
MP103 (x8)
MP38
Adhesive
Speaker
A1LS1
Knob MP31
Knob MP32
Nut MP36
Washer
MP37
Knob MP30
Display A1A1
MP102 (x4)
J1
J5
J2
J5
W200
A1A3
W203
W202
MP104 (x3)
A1R1
a1parts1.eps
Chapter 5
111
Disassembly
A2 Disassembly
A2 Disassembly
This section describes how to disassemble the A2 assembly. Use Table
5-1 below to see which assemblies are replaceable.
NOTE
Periodic Adjustment Intervals
The adjustment programs Periodic Calibration, IQ Calibration, and
Eb/No Calibration should be performed after any assembly referred to
in Table 7-1 on page 159 is replaced, or at least every 24 months. These
program can be run anytime to optimize the performance of the Test
Set. See Chapter 7 , “Periodic Adjustments,” on page 157 for details.
NOTE
Performance Test Intervals
The performance tests in Chapter 8 , “Performance Tests,” on page 173
should be performed when certain assemblies are repaired or replaced,
or at least every 24 months. See Table 3-2 on page 75 for those
assemblies requiring performance testing/calibration.
Table 5-1
A2 Assemblies
Module and PC Board Assemblies
see page 112
Control Interface Assembly
see page 117
PCMCIA Assembly
see page 116
RF Input/Output, Upconverter, & Downconverter
Assemblies
see page 118
LO IF/IQ Modulator and CDMA Generator Reference (Gen
Ref) Assemblies
see page 120
see page 122
see page 124
Module and PC Board Assemblies
1. Remove the Test Set’s external and top internal covers, see
“Removing the External and Internal Covers” on page 104.
2. Remove modules using a flat-blade screwdriver to pry them upward
from the chassis, see Figure 5-8 on page 113.
3. Remove PC board assemblies by lifting them from the chassis (some
assemblies have pull rings) and then disconnect any cables that may
be attached to it. See Figure 5-9 on page 114 for cable connections.
112
Chapter 5
Disassembly
A2 Disassembly
NOTE
For cable routing information see Table 5-2 on page 130.
Figure 5-8
Module and PC Board Assemblies
MODULATION DISTRIBUTION, A2A44
6 kHz BPF
A2A80A2
AUDIO ANALYZER #2, A2A40
C-MSSG
A2A80A1
AUDIO #1 ANALYZER
A2A80
CNTRL INTF
A2A70
Motherboard A2A1
RECEIVE DSP, A2A36
W204
J78
DATA BUFFER, A2A34
J76
F
A B
J3
SIG GEN SYNTH A2A25
RF OUPUT A2A24
REFERENCE A2A23
RCVR SYNTH A2A22
PCMCIA
Assembly
A2A10
RECEIVER A2A21
SPEC ANALYZER A2A20
DISPLAY DRIVE, A2A50
J8 J36 J37 J38 J9 J39 J39
W205
J4
CONTROLLER, A2A31
MEMORY (SBRC), A2A30
E
D
C
MEASUREMENT, A2A33
SIGNALING SOURCE, A2A32
J75
pcbremn2.eps
Pull-Ring
PC Board Assembly
J4
Module
J1
J2
k1©
k1
k2©
k2
k3©
k3
Me
nu
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set
Pau
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CD
Ge MA
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10
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7
Sh
Shift
ift
Hi
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Chapter 5
sh
t
8
lim
it
E
9
Pre
set
Me
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set
Ho
ld
113
Disassembly
A2 Disassembly
Figure 5-9
PC Board Assemblies
114
Chapter 5
Disassembly
A2 Disassembly
A2A80A1 and A2A80A2 Filter Assembly Removal
To remove either of the filter option assemblies on the A2A80 Audio
Analyzer 1 assembly:
1. Remove the A2A80 assembly from the Test Set.
2. Turn the plastic hex nut on each standoff a quarter turn and push
the standoffs through their holes to release the filter board from the
host board, see Figure 5-10. It may be necessary to compress or
squeeze the expandable flanges to slide them through the mounting
holes.
Figure 5-10
A2A80 Audio Analyzer 1 Assembly
Chapter 5
115
Disassembly
A2 Disassembly
PCMCIA Assembly
1. Remove the front frame, external cover, and the front internal cover
from the Test Set, see “Top Internal Covers” on page 105.
2. Remove the memory card from the card slot.
3. See Figure 5-11. Remove the two screws and disconnect ribbon cable
W201 from the PCMCIA assembly. Lift the assembly from the
chassis.
Figure 5-11
PCMCIA Assembly Removal
116
Chapter 5
Disassembly
A2 Disassembly
Control Interface Assembly
1. Remove the standoffs and screwlocks from the connector panel as
shown in Figure 5-12 on page 117 from the Test Set.
2. Disconnect ribbon cable W204 from the A2A70 assembly to remove
the assembly.
Figure 5-12
Control Interface Assembly Removal
J3
Control Interface Board
A2A70
J8
J2
Washer
MP108 (x10)
J4
Screwlock
MP107 (x10)
J5
J6
Washer
MP109 (x2)
Screw (x4)
MP110
A2J3
Nut
MP106 (x2)
A2J2
Same for A2J3 and A2J4.
Nut
MP20 (17x)
A2J2
Control Interface Board
A2A70
to Controller Assembly
A2A31 J1
J1
W204
J7
J10
a2a70_2.eps
Chapter 5
117
Disassembly
A2 Disassembly
RF Input/Output, Upconverter, & Downconverter
Assemblies
The RF Input/Output A2A130, Upconverter A2A130, and
Downconverter A2A115 assemblies are secured in an interlocking
manner and are disassembled in the following order:
RF Input/Out Assembly Removal
1. Remove the bottom cover of the Test Set. See “Removing the
External and Internal Covers” on page 104.
2. Disconnect cables: W101, W122, W121, W110, W211, W67, and
W120. See Figure 5-13 on page 119.
3. Remove the four torx screws (MP101) securing the RF Input/Output
assembly to the other assemblies.
4. Slide the RF Input/Output assembly away from the Downconverter
assembly’s slot to remove the assembly.
Upconverter Assembly Removal
1. Remove the RF Input/Output as previously instructed.
2. Disconnect cables: W101, W210, W100, and W24. See Figure 5-13 on
page 119.
3. Remove the four torx screws securing this assembly and lift it away
from the chassis.
Downconverter Assembly Removal
1. Remove the RF Input/Output and Upconverter assemblies as
previously instructed.
2. Disconnect cables: W110, W212, W56, and W57. See Figure 5-13 on
page 119.
3. Remove the four torx screws securing this assembly and lift it away
from the chassis.
When reassembling, reverse the order of disassembly, that is, install the
Downconverter assembly first, the Upconverter second, and the RF
Input/Output assembly last. For wire/cable routing information, see
Table 5-2 on page 130.
118
Chapter 5
Disassembly
A2 Disassembly
Figure 5-13
RF Input/Output, Upconverter, & Downconverter Removal
W211
W50
to A2A1 J34
RF Input/Output
Assembly
A2A130
J7
W110 or W125
J1
W121
W122
J5
J4
J6
MP101
W100
J3
W120
MP105
W210
to
A2A1 J32
MP101
J2
W24
MP111
J3
W101
MP105
MP101
W212
J4
J1
MP101
MP111
MP100
MP
110
J2
J4
W56
Upconverter
Assembly
A2A110
W57
W110 or W124
MP110
MP105
J3
J2
J1
MP105
Downconverter
Assembly
A2A115
Chapter 5
partmod1.eps
119
Disassembly
A2 Disassembly
LO IF/IQ Modulator and CDMA Generator Reference (Gen
Ref) Assemblies
The LO IF/IQ Modulator and Gen Ref assemblies need to be removed in
the following order. See Figure 5-14 on page 121.
Removing the LO IF/IQ Modulator Assembly
1. Remove the bottom cover, see “Bottom Internal Cover” on page 108.
2. Disconnect the cables shown in Figure 5-14 on page 121.
3. Remove the nine torx screws that secure this assembly to the
chassis.
Removing the Gen Ref Assembly
1. Remove the LO IF/IQ Modulator assembly.
2. Disconnect the cables shown in Figure 5-14 on page 121.
3. Remove the nine torx screws securing the assembly to the chassis
and lift the assembly.
When re-installing the assemblies, install the Gen Ref assembly first.
120
Chapter 5
Disassembly
A2 Disassembly
Figure 5-14
LO IF/IQ Modulator & CDMA Generator Reference Removal
MP101 (x9)
LO IF/IQ MOD Assembly
A2A120
W214
Gen Ref Assembly
A2A100
J
3
W215
MP101 (x7)
1
J
6
1
J
7
1
J
2
1
J
4
3
1
1
J
J
5
1
J
2
J
0
1
J
1
1
J
MP101 (x8)
W216
8
J
9
J
7
J
6 5
J J
Gen Ref Assembly
A2A100
J16
J17
J15
J14
J12 J10
J8
J6
J7
J9
J5
J13
J11
W61 W58
BLU RED
W17 W16
GRN ORG
W15
PRL
W55
BLK
W14
GRY
W54
YEL
MP101 (x8)
W13 W12 W11
WHT BLU RED
W58 RED
LO IF/IQ MOD
Assembly A2A120
W63 YEL
W50 BLK
W51 WHT
W64 GRN
W213
a2a120_2.eps
W61 BLU
W62 GRY
W53 BRN
Chapter 5
MP101 (x4)
MP101 (x5)
121
Disassembly
A2 Disassembly
Attenuator Assembly
1. Remove the front, side, and rear external covers, and the top and
bottom internal covers, see “Removing the External and Internal
Covers” on page 104.
2. Remove the power supply assembly, see “A3 Disassembly” on page
126.
3. Turn the Test Set over and disconnect flex connectors W120 and
W123 from the attenuator, see Figure 5-15.
4. Remove the four screws that secure the attenuator to the chassis, see
Figure 5-15.
122
Chapter 5
Disassembly
A2 Disassembly
Figure 5-15
Attenuator Assembly Removal
A2 Assembly
(Rear View)
Attenuator
A2A200
A2 Assembly
(Rear View)
Attenuator
A2A200
W120
(A2A200 OUT)
W123
(A2A200 INPUT)
MP 101 (4x)
a2a200 1.eps
Chapter 5
123
Disassembly
A2 Disassembly
Motherboard Assembly
1. Remove the all external and internal (top and bottom) covers from
the Test Set, see “Removing the External and Internal Covers” on
page 104.
2. Remove all the modules and PC board assemblies. See “Module and
PC Board Assemblies” on page 112.
3. Remove the A1 front panel and A3 rear panel assemblies. See “A1
Disassembly” on page 110 and “A3 Disassembly” on page 126.
4. Remove the six torx screws securing the sheet metal divider and
then remove the divider, see Figure 5-16 on page 125.
5. Disconnect all the connectors on the topside of the motherboard.
6. Disconnect all the connectors on the bottom side of the motherboard.
7. Remove the 11 torx screws securing the motherboard to the chassis
and lift it up to remove it.
To reassemble the Test Set, perform the previous steps in reverse order.
For wire/cable routing information, see Table 5-2 on page 130.
124
Chapter 5
Disassembly
A2 Disassembly
Figure 5-16
Motherboard Removal
Sheet Metal Divider MP19
MP101 (x11)
Motherboard
A2A1
MP101 (x3)
S
P
E
C
R
C
V
R
R
E
C
E
IV
E
R
A
N
A
LY
Z
E
R
O
U
T
P
U
T
R
E
F
E
R
E
N
C
E
S
Y
N
T
H
S
P
E
C
S
IG
S
E
C
T
G
E
N
S
Y
N
T
H
R
C
V
R
R
E
C
E
IV
E
R
A
N
A
LY
Z
E
R
O
U
T
P
U
T
R
E
F
E
R
E
N
C
E
S
Y
N
T
H
S
IG
S
E
C
T
G
E
N
S
Y
N
T
H
Sub Frame MP16
Gasket MP18
MP101 (x3)
mom1.eps
Chapter 5
125
Disassembly
A3 Disassembly
A3 Disassembly
1. Remove the Test Set’s external and internal covers, see “Removing
the External and Internal Covers” on page 104.
2. Remove the eighteen torx screws securing the A3 assembly to the A2
assembly, see Figure 5-17.
3. Move the A3 assembly away from the A2 assembly and disconnect
cables W220 and W221.
Figure 5-17
A3 Rear Panel Assembly
W221
W220
A2 Assembly
(Rear View)
MP101 (x18)
A3 Assembly
126
A3disas1a.eps
Chapter 5
Disassembly
A3 Disassembly
Removing the Power Supply Regulator Assembly
To remove the A3A1 regulator assembly, disconnect the cables and the
four torx screws shown in Figure 5-18.
Figure 5-18
A3A1 Regulator Assembly
W221
W223
J6
Regulator Assembly
A3A1
r
O
pw
P
to
W
l
pp
su
E
y
R
S
W
J3
A
F
N
to
J4
J1
to
pw
Power Switch Cable
(part of A3S1)
hr
ot
l
pp
su
m
r
bd
y
J2
J7
W222
J5
W220
Fan Cable
(part of A3A1)
Battery Cable
(part of A3A4)
4
J1
3
J1
J7
A3A1 Assembly
reg_rmv2.eps
Removing the Power Supply Assembly
1. Remove the regulator assembly.
2. Remove the power supply cover from the A3 assembly, see Figure
5-19 on page 128.
3. Disconnect cables W222, W223, and GFI-assembly cable at J7.
4. Remove the four screws securing the power supply to the rear sub
panel.
Chapter 5
127
Disassembly
A3 Disassembly
Figure 5-19
Power Supply Removal
Power Supply
Cover
Rear
Sub-Panel
J1
4
J1
3
ps_cvr1.eps
J7
128
Chapter 5
Disassembly
A3 Disassembly
Power Supply Switch, Fan, & Battery Holder Assemblies
1. Remove the regulator assembly, see “Removing the Power Supply
Regulator Assembly” on page 127, and power-supply cover and
subassemblies, see “Removing the Power Supply Assembly” on page
127.
2. To remove the fan, remove the three screws shown in Figure 5-20
3. The A3S1 power switch assembly is normally riveted in place.
However this assembly is replaceable and screws can be used to
replace the rivets, see Figure 5-20.
Figure 5-20
Fan and Power Switch Assemblies
Fan
Switch
A3A1 Assembly
Screws (x3)
NOTE: Battery Holder (shown below)
is part of A3A1 assembly.
A3A1 Assembly
Battery Holder
fan_rmv2a.eps
Chapter 5
129
Disassembly
Wire/Cable Information
Wire/Cable Information
Table 5-2
Wire/Cable List
Wire #
From
To
Part Number
W1
"AUDIO OUT" (Panel)
A2A1 J8
E6380-61039
W2
"AUDIO IN - HI" (Panel)
A2A1 J9
E6380-61039
W3
"AUDIO IN - LO" (Panel)
A2A1 J11
E6380-61039
W4
"BASEBAND OUT - I" (Panel)
A2A34 J402
E6380-61043
W5
"BASEBAND OUT - Q" (Panel)
A2A34 J502
E6380-61043
W6
"DATA IN" (Panel)
A2A34 J22
E6380-61045
W7
"ANALOG MODULATION
IN" (Panel)
A2A1 J36
E6380-61039
W8
"SCOPE MONITOR OUT"
(Panel)
A2A1 J37
E6380-61039
W9
"EXT SCOPE TRIG IN"
(Panel)
A2A1 J38
E6380-61039
W10
"VIDEO OUT" (Panel)
A2A1 J39
E6380-61039
W11
A2A100 J5 (RED)
"16X CHIP CLOCK
19.6608 MHz OUT" (RED Panel)
E6380-61073
(future use)
A2A100 J6
N/A
N/A
(future use)
A2A100 J16
N/A
N/A
W12
A2A100 J7 (BLU)
"CHIP CLOCK 1.2288
MHz OUT" (BLU - Panel)
E6380-61074
W13
A2A100 J9 (WHT)
"FRAME CLOCK OUT"
(WHT - Panel)
E6380-61072
W14
A2A100 J11 (GRY)
"EVEN SECOND SYNC
IN" (GRY - Panel)
8120-5837
W15
A2A100 J13 (PRL)
"TRIGGER QUALIFIER
IN" (PRL - Panel)
E6380-61075
W16
A2A100 J15 (ORG)
"10 MHz REF OUT" (ORG
- Panel)
E6380-61076
W17
A2A100 J17
"EXT REF IN" (GRN Panel)
E6380-61077
W18-W23
NOT USED
W24
A2A1 J4 (GRY)
130
N/A
A2A110 J3
E6380-61047
Chapter 5
Disassembly
Wire/Cable Information
Table 5-2
Wire/Cable List
Wire #
From
To
Part Number
W25
A2A1 J76
A2A34 J709 "1.2200
MHz_DATA_OUT"
E6380-61044
W26
A2A1 J75
A2A34 J4 "19.6 MHz IN"
E6380-61042
W27
A2A1 "B"
A2A34 J501
E6380-61040
W28
A2A1 "F"
A2A34 J401
E6380-61040
W29
A2A1 "A"
A2A36 J6
E6380-61041
W30
A2A1 "E"
A2A36 J3
E6380-61041
W31
A2A1 "D"
A2A34 J500
E6380-61040
W32
A2A1 "C"
A2A34 J400
E6380-61040
W33
A2A1 J78
A2A36 J4
E6380-61042
W34-W49
NOT USED
W50
A2A1 "C" (BLK)
A2A120 J3 I/Q "I IN"
(BLK)
E6380-61055
W51
A2A1 "D" (WHT)
A2A120 J2 I/Q "Q IN"
(WHT)
E6380-61065
W52
A2A1 "E" (GRY)
A2A130 J7 (RF I/O - GRY)
E6380-61051
W53
A2A1 "A" (BRN)
A2A120 J4 LO/IF "3.69
MIF" (BRN)
E6380-61066
W54
A2A1 "B" (YEL)
A2A100 J8 (YEL)
E6380-61078
W55
A2A1 "F" (BLK)
A2A100 J10 (BLK)
E6380-61046
W56
A2A115 J3 (GRY)
A2A1 J2 "RCVR LO"
(GRY)
E6380-61050
W57
A2A115 J2 (ORG)
A2A1 J1 "RCVR IN" (ORG)
E6380-61064
W58
A2A120 J5 "QTUNE" (RED)
A2A100 J12 (RED)
E6380-61063
W59-W60
NOT USED
W61
A2A100 J14 (BLU)
A2A120 J2 "REF IN"
(BLU)
E6380-61061
W62
A2A120 J3 LO/IF "114.3 M IF
IN" (GRY)
A2A1 J5 "114.3 MHz IF
OUT" (GRY)
E6380-61060
W63
A2A120 J4 "IQ RF OUT"
(YLW)
A2A1 J7 "I\Q OUT" (YLW)
E6380-61059
W64
A2A120 J1 "CW RF IN"
(GRN)
A2A1 J6 "I\Q IN" (GRN)
E6380-61059
Chapter 5
N/A
N/A
131
Disassembly
Wire/Cable Information
Table 5-2
Wire/Cable List
Wire #
From
W65-W99
NOT USED
W100
A2A1 J3 "RF OUT"
A2A110 J1
E6380-61021
W101
A2A110 J2
A2A130 J2
E6380-61020
W102-W109
NOT USED
W110
A2A115 J1
W120
NOT USED
W121
A2A130 J4
A2 J2 "ANT IN" (Panel)
E6380-61019
W122
A2A130 J6
A2 J3 "DUPLEX OUT"
(Panel)
E6380-61018
W123
A2 J4 "RF IN/OUT" (Panel)
A2A200 "INPUT"
E6380-61016
W124
A2U1 “DC BLOCK”
A2A200 “OUT”
E6380-61111
W125
A2A130 J3
A2U1 “DC BLOCK”
E6380-61112
W126-W199
NOT USED
W200
A2A1 J79
A1A1 J2
E6380-61062
W201
A2A1 J59
A2A10 J1
E6380-61015
W202
A2A1 J49
A1A3
E6380-61022
W203
A1A3 J2
A1A2 (keypad assembly)
E6380-61068
W204
A2A31 J1
A2A70 J1
E6380-61023
W205
A2A31 J4
A2A30 J3
E6380-61052
W206-W209
NOT USED
W210
A2A110 J4
A2A1 J32 "Up Converter"
E6380-61029
W211
A2A130 J1
A2A1 J34
E6380-61029
W212
A2A115 J4
A2A1 J31
E6380-61029
W213
A2A120 J1
A2A1 J35
E6380-61028
W214
A2A1 J64
A2A100 J3
E6380-61027
W215
A2A1 J63
A2A100 J1
E6380-61026
W216
A2A1 J62
A2A100 J2
E6380-61026
W217-W219
NOT USED
W220
A3A1 J2
132
To
Part Number
N/A
N/A
A2A130 J5
E6380-61034
E6380-61017
N/A
N/A
N/A
A2A1 J54
E6380-61071
Chapter 5
Disassembly
Wire/Cable Information
Table 5-2
Wire/Cable List
Wire #
From
To
Part Number
W221
A3A1 J5
A2A1 J73 (multiconductor
power cable)
E6380-61036
W222
A3A1 J6
POWER SUPPLY, A3A2
J14
E6380-61049
W223
A3A1 J1
POWER SUPPLY, A3A2
J13
E6380-61035
(cable part of
A3A4
assembly)
BATTERY HOLDER
ASSEMBLY, A3A4
A3A1 J7
N/A
(cable part of
A3S1
assembly)
POWER SWITCH, A3S1
A3A1 J3
N/A
(cable part of
A3B1
assembly)
FAN ASSEMBLY, A3B1
A3A1 J4
N/A
(cable part of
A3A3
assembly)
LINE MODULE ASSEMBLY,
A3A3
OEM POWER SUPPLY, J7
N/A
Chapter 5
133
Disassembly
Wire/Cable Information
134
Chapter 5
6
Replaceable Parts
This chapter contains the replaceable assembly and component
information for the Test Set. Use the illustrations in this chapter to
identify the replaceable parts and the “Parts List” on page 150 for part
numbers.
135
Replaceable Parts
Replacement & Ordering Parts
Replacement & Ordering Parts
Direct Parts Ordering
See “Factory Support” on page 46. The Agilent Support Materials
Organization can help you order and identify parts.
Assembly Replacements
With some assemblies you will receive a Memory Card that contains
factory-generated calibration data for that assembly. There will also be
an instruction sheet for loading the calibration data into your Test Set
after you’ve replaced the assembly.
NOTE
Periodic Adjustment Interval
The adjustment programs Periodic Calibration, IQ Calibration, and
Eb/No Calibration should be performed after any assembly referred to
in Table 7-1 on page 159 is replaced, or at least every 24 months. These
program can be run anytime to optimize the performance of the Test
Set. See Chapter 7 , “Periodic Adjustments,” on page 157 for details.
NOTE
Performance Test Interval
The performance tests in Chapter 8 , “Performance Tests,” on page 173
should be performed when certain assemblies are repaired or replaced,
or at least every 24 months. See Table 3-2 on page 75 for those
assemblies requiring performance testing/calibration.
136
Chapter 6
Replaceable Parts
Parts Identification
Parts Identification
Major Assembly Overview
Shown below is a top view of the Test Set with external and internal
covers removed. The Test Set can be separated into three major
assemblies designated: A1, A2, and A3. Throughout this chapter the
reference designator for each sub assembly is prefixed with its major
assembly’s designator. Take for example the PCMCIA assembly’s
reference designator A2A10: “A2” refers to the A2 major assembly and
“A10” refers to the PCMCIA sub assembly which is part of A2.
Major Assemblies
A3
Assembly
MOD. DISTRIBUTION, A2A44
6kHz BP
A2A80A2
AUDIO #2, A2A40
C-MSSG
A2A80A1
AUDIO #1, A2A80
CONTROL INTERFACE
A2A70
MOTHERBOARD A2A1
RECEIVE DSP, A2A36
W204
DATA BUFFER, A2A34
C
MEASUREMENT, A2A33
D
SIGNAL SOURCE, A2A32
F
D. DRIVE, A2A50
A B
MEMORY (SBRC), A2A30
E
CONTROLLER, A2A31
W205
A2
J4
SIG GEN SYNTH A2A25
RF OUPUT A2A24
REFERENCE A2A23
RCVR SYNTH A2A22
RECEIVER A2A21
J59
W201
SPEC ANALYZER A2A20
MOTHERBOARD A2A1
J8 J36 J37 J38 J9 J39 J11
Assembly
PCMCIA
A2A10
J3
Figure 6-1
A1
Assembly
Display
A1A1
Chapter 6
Speaker
A1LS1
RPG
A1A3
Keypad
A1A2
a2ovrvw1.eps
137
Replaceable Parts
Parts Identification
Covers and Chassis Parts
Figure 6-2
External and Internal Covers
138
Chapter 6
Replaceable Parts
Parts Identification
A1 Assemblies
Figure 6-3
A1 Assembly - Front Panel
Keypad A1A2
(sheet metal frame included)
Screen MP35
Frame MP34
MP103 (x8)
MP33
Knob MP31
Knob MP32
Nut MP36
Speaker
A1LS1
Washer
MP37
Knob MP30
Display A1A1
MP102 (x4)
J1
J5
J2
J5
W200
A1A3
W203
W202
MP104 (x3)
A1R1
a1parts1.eps
Chapter 6
139
Replaceable Parts
Parts Identification
A2 Assemblies
Module and PCB Board Assemblies
Figure 6-4
A3
Assembly
MOD. DISTRIBUTION, A2A44
6kHz BP
A2A80A2
AUDIO 2, A2A40
C-MSSG
A2A80A1
AUDIO 1, A2A80
CONTROL INTERFACE
A2A70
MOTHERBOARD A2A1
RECEIVE DSP, A2A36
W204
DATA BUFFER, A2A34
C
MEASUREMENT, A2A33
D
SIGNAL SOURCE, A2A32
F
MEMORY A2A30A1
MEMORY (SBRC), A2A30 D. DRIVE, A2A50
A B
E
CONTROLLER, A2A31
W205
A2
J4
SIG GEN SYNTH A2A25
RF OUPUT A2A24
REFERENCE A2A23
RCVR SYNTH A2A22
RECEIVER A2A21
J59
W201
SPEC ANALYZER A2A20
MOTHERBOARD A2A1
J8 J36 J37 J38 J9 J39 J11
Assembly
J3
PCMCIA
A2A10
A1
Assembly
Display
A1A1
140
Speaker
A1LS1
RPG
A1A3
Keypad
A1A2
a2ovrvw1a.eps
Chapter 6
Replaceable Parts
Parts Identification
PCB Assemblies
Figure 6-5
AU
DIO
DATA BUFFER, A2A34 Assembly
J709
J22
W4
W25
J402 "RP I SIG"
to A2A1 J76
"DATA IN"
W6
J400 "SIG OUT"
J401 "I INPUT"
to panel
"DATA IN"
J501 "Q INPUT"
J500 "Q SIG OUT"
J4
J502 "RP Q SIG"
"19.6 MHz IN"
(Fi
lte
C- r OP
MS T
SG 1
)
W32
W28
W27
W31
A2
A8
#1,
A2
A8
0A
sse
mb
ly
0A
1
W5
W26 to A2A1 J75
(Fi
"16X CHIP"
lte
r
6k OPT
BP 2
F)
A2
A8
0A
2
1/4 turn to remove
or secure option board.
RECEIVE DSP, A2A36 Assembly
MEMORY/SBRC, A2A30 Assembly
TP4
J3
W33
J6
J3
W30
to A2A1 "E"
J4
W33
to A2A1 J78 "4X CHIP"
J2
J1
CONTROLLER, A2A31 Assembly
TP1 TP2
J1
P2
J4
P1
a2_pcbs2.eps
Chapter 6
141
Replaceable Parts
Parts Identification
PCMCIA Assembly
Figure 6-6
J1
J5
J2
J5
a2a10.eps
MP101
PCMCIA Assembly
A2A10
MP101
W201
J1
to Motherboard
A2A1 J59
Attenuator Assembly
Figure 6-7
A2 Assembly
(Rear View)
Attenuator
A2A200
A2 Assembly
(Rear View)
W120
(A2A200 OUT)
W123
(A2A200 INPUT)
Attenuator
A2A200
MP 101 (4x)
a2a200_1.eps
142
Chapter 6
Replaceable Parts
Parts Identification
Control Interface Assembly & Connectors
Figure 6-8
J3
Control Interface Board
A2A70
J8
J2
Washer
MP108 (x10)
J4
Screwlock
MP107 (x10)
J5
J6
Washer
MP109 (x2)
Screw (x4)
MP110
A2J3
Nut
MP106 (x2)
A2J2
Same for A2J3 and A2J4.
Nut
MP20 (17x)
A2J2
Control Interface Board
A2A70
to Controller Assembly
A2A31 J1
J1
W204
J7
J10
a2a70_2.eps
Chapter 6
143
Replaceable Parts
Parts Identification
RF/IO, Up Converter, and Down Converter Assemblies
Figure 6-9
W211
W52
to A2A1 J34
RF Input/Output
Assembly
A2A130
W121
J7
W110
J1
W122
J5
J4
J6
MP101
W100
(from A2A1 J4)
J3
MP105
W210
W24 (from
A2A1 J4)
to
A2A1 J32
MP111
J3
5
W120
MP101
J2
W101
MP105
MP101
W212
J4
J1
MP101
MP111
MP100
MP
110
J2
J4
W56
Upconverter
Assembly
A2A110
W57
W110
MP110
MP105
J3
J2
J1
MP105
Downconverter
Assembly
A2A115
144
partmod1.eps
Chapter 6
Replaceable Parts
Parts Identification
LO IF/IQ MOD and GEN REF Assemblies
Figure 6-10
MP101 (x9)
LO IF/IQ MOD Assembly
A2A120
W214
Gen Ref Assembly
A2A100
J3
W215
MP101 (x7)
J1
7
J1
J1
6
J1
J1
5
4
J1
J1
3
2
J1
0
J2
J1
1
MP101 (x8)
W216
J9
J8
J7
J6
J5
Gen Ref Assembly
A2A100
J16
J17
J15
J8
J6
J12 J10
J14
J7
J9
J5
J13
J11
W61 W58
BLU RED
W17 W16
GRN ORG
W15
PRL
W55
BLK
W14
GRY
W54
YEL
W13 W12 W11
WHT BLU RED
MP101 (x8)
W58 RED
LO IF/IQ MOD
Assembly A2A120
W63 YEL
W50 BLK
W51 WHT
W64 GRN
W213
a2a120_2.eps
Chapter 6
W61 BLU
W62 GRY
W53 BRN
MP101 (x4)
MP101 (x5)
145
Replaceable Parts
Parts Identification
Motherboard and Sub Frame
Figure 6-11
Sheet Metal Divider MP19
MP101 (x11)
Motherboard
A2A1
MP101 (x3)
S
P
E
C
R
C
V
R
R
E
C
E
IV
E
R
A
N
A
LY
Z
E
R
O
U
T
P
U
T
R
E
F
E
R
E
N
C
E
S
Y
N
T
H
S
P
E
C
S
IG
S
E
C
T
G
E
N
S
Y
N
T
H
R
C
V
R
R
E
C
E
IV
E
R
A
N
A
LY
Z
E
R
O
U
T
P
U
T
R
E
F
E
R
E
N
C
E
S
Y
N
T
H
S
IG
S
E
C
T
G
E
N
S
Y
N
T
H
Sub Frame MP16
MP101 (x3)
Gasket MP18
mom_rmv1.eps
146
Chapter 6
Replaceable Parts
Parts Identification
A3 Rear Panel Assembly
Figure 6-12
W221
Regulator Assembly A3A1
MP101 (x4)
to
r
pw
P
ly
pp
su
E
W
O
R
W
S
J6
J3
N
A
F
J4
to
to
r
pw
hr
ot
m
bd
ly
pp
su
J1
W223
J7
J2
J5
W220
Switch A3S1
Part of A3A4
Battery Holder
Assembly
MP102
(x10)
W222
Power Supply
Cover MP51
to A3A1 J4
MP101 (x4)
Fan A3B1
4
J1
3
J1
Power Supply A3A2
from
GFI assembly
J7
MP101 (x4)
MP101 (x4)
Rear Sub-Panel
MP50
MP101 (x3)
Switch A3S1
to A3A1 J7
Battery Holder
A3A4
MP101 (x4)
a3prts_3a.eps
MP101 (x3)
Chapter 6
147
Replaceable Parts
Parts Identification
Cable Assemblies
Figure 6-13
Cables, Top View
W30 "E"
W28 "F"
W31 "D"
W29 "A"
W32 "C"
W27 "B"
F
E
B
A
D
C
Motherboard
Top Side
A3 POWER SUPPLY
MP 112
Washer (6x)
MP 113
Nut (6x)
Motherboard
Bottom Side
6kHz BPF
A2A80A2
MOD. DISTRIBUTOR, A2A44
AUDIO 2, A2A40
C-MSSG
A2A80A1
W53 "A"
BRN
AUDIO 1, A2A80
Motherboard A2A1
W50 "C"
BLK
W54 "B"
YEL
CONTROL INTERFACE
A2A70
RECEIVE DSP, A2A36
J76
C
SIGNALING SOURCE, A2A32
A B
W52 "E"
GRY
F
J8 J36 J37 J38 J9 J39 J11
SIG GEN SYNTH A2A25
RF OUPUT A2A24
RCVR SYNTH A2A22
REFERENCE A2A23
RECEIVER A2A21
SPEC ANALYZER A2A20
Cnctr.- Cable
J4 - W24
J8 - W1
J36 - W7
J37 - W8
J38 - W9
J9 - W2
J39 - W10
J11 - W3
To
A2A110 J3
AUDIO OUT
ANALOG MOD. IN
SCOPE MONITOR OUT
EXT. SCOPE TRIG. IN
AUDIO IN HI
VIDEO OUT
AUDIO IN LO
Wx
Jx
PCMCIA
A2A10
J3
W201
J59
D. DRIVE, A2A50
J4
MEMORY (SBRC), A2A30
Motherboard A2A1
W55 "F"
BLK
E
CONTROLLER, A2A31
W205
W51 "D"
WHT
J75
D
MEASUREMENT, A2A33
W204
J78
DATA BUFFER, A2A34
A2A1 J3
(on Motherboard,
topside)
W100
to Up Converter
A2A110 J1
a2ovrvw2.eps
148
Chapter 6
Replaceable Parts
Parts Identification
Figure 6-14
Cables, Panel and Bottom Side Views
Chapter 6
149
Replaceable Parts
Parts List
Parts List
Table 6-1
Ref. Des.
Description
Part Number
A1
FRNT PNL KIT
E6380-61891
A1A1
EL DISPLAY 6.5IN
2090-0573
A1A2
KEYPAD W/FRAME KIT
E6380-61856
A1A3
RPG BD KIT
E6380-61805
A1LS1
SPEAKER ASSEMBLY
E6380-61037
A1R1
HARN SPKR ASSY
E6380-61057
A2A1
MTHR BD KIT
E6380-61802
A2A10
PCMCIA KIT
E6380-61803
A2A20
SPECTRUM ANAL #002/102
08920-61852
A2A21
RECEIVER KIT
E6380-61866
A2A22
RCVR SYNTH KIT
08921-61820
A2A23
HI STB REFERENCE KT
08920-61835
A2A23
REFERENCE KIT
08920-61829
A2A24
RF OUTPUT KIT
E6380-61832
A2A25
SIGGEN SYNTH KIT
08921-61819
A2A30
MEMORY (SBRC) KIT
E6380-61801
A2A30A1
RAM DAUGHTER BD
E6380-60114
A2A31
CONTROLLER KIT
E6380-61812
A2A32
SIGNAL SOURCE KIT
08920-61850
A2A33
MEASUREMENT KIT
08920-61836
A2A34
DATA BUFFER KIT
E6380-61896
A2A36
RX/DSP KIT
E6380-61895
A2A40
AUDIO ANALYZER 2 KIT
08920-61853
A2A44
MOD DISTRIBUTION KIT
08920-61809
A2A50
DISPLAY DRIVER KIT
E6380-61816
A2A70
CONTROL INTERFACE KIT
E6380-61815
150
Chapter 6
Replaceable Parts
Parts List
Table 6-1
Ref. Des.
Description
Part Number
A2A80
AUDIO ANALYZER #1 KIT
08920-61811
A2A90A1
1C-MESS FLTR
08920-61056
A2A90A2
6KHZ BP FLT
08920-61063
A2A100
GEN/REF KIT
E6380-61807
A2A110
UPCONV KIT
E6380-61809
A2A115
DNCONV KIT
E6380-61808
A2A120
LO_IF/IQ_MOD KT
E6380-61817
A2A130
RF/IO KIT
E6380-61810
A2A200
100W ATTEN KIT
E6380-61892
A2J1
BDG POST ASSY
1510-0038
A2J2,A2J3,
A2J4
ADPTR-COAX SMA-N
1250-2621
A2U1
DC BLOCK ASSEMBLY
0955-1125
A3
REAR PANEL KIT
E6380-61899
A3A1
POWER SUPPLY REG KIT
E6380-61804
A3A2
POWER SUPPLY
0950-3690
A3A3
HRN LINE MOD
E6380-61097
A3A4
CA AY-HARN,BTRY
E6380-61025
A3B1
FAN AY
E6380-61091
A3F1
FUSE, T 5.0A
2110-0882
A3S1
HRN PWR SWITCH
E6380-61014
ACC1
CD-ROM MANUALS
E6380-90027
ACC2
ALR MANUAL
E6380-90015
ACC3
PROG GUIDE
E6380-90018
ACC4
REF GUIDE
E6380-90019
ACC5
AMPS APP GUIDE
E6380-90017
ACC6
CDMA APP GUIDE
E6380-90016
Chapter 6
151
Replaceable Parts
Parts List
Table 6-1
Ref. Des.
Description
Part Number
ACC7
FW REPLMT KIT
E6380-61858
ACC8
KIT-SYS PWR CAL
E6380-61811
MP1
AY-IMPACT COVER
E6380-61099
MP2
AY FRONT FRAME
E6380-61080
MP3
NAMEPLATE
E6380-00002
MP4
CARD DOOR
E6380-40006
MP5
SPRING-COVER
E6380-21028
MP6
FOOT
E6380-40009
MP7
COVER-EXT
E6380-00019
MP8
FILTER-AIR
E6380-00042
MP9
AY-SIDE FRAME
E6380-61098
MP10
AY-STRAP HANDLE
E6380-61079
MP11
REAR FRAME AY
E6380-61097
MP12
COVER-TOP
E6380-00014
MP13
COVER AY-MODULE
E6380-61095
MP14
COVER-DIGITAL
E6380-00037
MP15
COVER-BOTTOM
E6380-00015
MP16
AY-SUB FRAME
E6380-61008
MP18
GASKET-MOTHER BD
E6380-00034
MP19
DIVIDER
E6380-00009
MP20
NUT-HEX 15/32-32
0590-2332
MP30
KNOB BASE.250 JG
0370-2110
MP31
KNOB-06.5
E6380-40012
MP32
KNOB-016.3
E6380-40011
MP33
FOAM SPACER-SPKR
E6380-00038
MP34
FRAME-WINDOW
E6380-21011
MP35
WINDOW-DISPLAY
E6380-21009
MP36
NUT HEX 1/4-36
2950-0196
152
Chapter 6
Replaceable Parts
Parts List
Table 6-1
Ref. Des.
Description
Part Number
MP37
WSHR LK .256ID
2190-0027
MP50
SUBPANEL-REAR
E6380-61107
MP51
COVER-POWER SUPPLY
E6380-00064
MP100
CLAMP-CABLE
1400-1391
MP101
SMM4.0 10SEMPNTX
0515-0380
MP102
SMM3.0 8SEMPNTX
0515-0374
MP103
SMM3.0 6 FL TX
0515-1227
MP104
SMM3.0 6SEMPNTX
0515-2126
MP105
SMM4.0 20MML
0515-0456
MP106
STDF .327L 6-32
0380-0644
MP107
CONN SCREWLOCK F
0380-2079
MP108
WSHR-LK HLCL #4
2190-0003
MP109
WSHR LK .1941D
2190-0577
MP110
SMM4.0 12SEMPNTX
0515-2243
MP111
SMM4.0 16SEMPNTX
0515-2245
MP112
WSHR-LK IN T #10
2190-0124
MP113
NUT-HEX 10-32
2950-0078
MP114
DC BLOCK BRKT
E6380-00069
MP115
TIE WRAP
1400-0249
MP116
MODULE COVER ASSEMBLY
E6380-61086
W1,W2,W3,
W7,
W8,W9,W10
CX F BNC-SMB 150
E6380-61039
W4,W5
CX F BNC-SMB 200
E6380-61043
W6
CX F BNC-PST 425
E6380-61045
W11
CA F SMB-BNC 525
E6380-61073
W12
CA F SMB-BNC 525
E6380-61074
W13
CA AY-BNC-SMB
E6380-61072
W14
CA AY-SMB BNC
8120-5837
Chapter 6
153
Replaceable Parts
Parts List
Table 6-1
Ref. Des.
Description
Part Number
W15
CA F SMB-BNC 525
E6380-61075
W16
CA AY-BNC-SMB
E6380-61076
W17
CA F SMB-BNC 525
E6380-61077
W24
CX F SMB-SMB 250
E6380-61047
W25
CX F SMB-PST 175
E6380-61044
W26,W33
CX F SMB-SMB 175
E6380-61042
W27,W28,
W31,
W32,W55
CX F SMB-SMB 250
E6380-61040
W29,W30
CX F SMB-SMB 450
E6380-61041
W50
CX F SMB-SMB 310
E6380-61055
W51
CX F SMB-SMB 750
E6380-61065
W52
CX F SMC-SMB
E6380-61051
W53
CX F SMB-SMB 550
E6380-61066
W54
CA AY MCNDCT 16
E6380-61078
W56
CX F SMB-SMB 275
E6380-61050
W57
CX F SMB-SMB 280
E6380-61064
W58
CX F SMB-SMC 440
E6380-61063
W61
CX F SMB-SMB 240
E6380-61061
W62
CX F SMB-SMB M80
E6380-61060
W63
CX F SMC-SMB 250
E6380-61059
W64
CX F SMC-SMB 165
E6380-61058
W100
SR 2.18 SMA-SMA
E6380-61021
W101
SR 2.18 SMA-SMA
E6380-61020
W110
SR 3.58 SMA-SMA
E6380-61034
W120
CA AY-SR,ATTN RFIO
E6380-61017
W121
SR 3.58 SMA-SMA
E6380-61019
W122
SR 3.58 SMA-SMA
E6380-61018
W123
SR 3.58 SMA-SMA
E6380-61016
154
Chapter 6
Replaceable Parts
Parts List
Table 6-1
Ref. Des.
Description
Part Number
W124
S/R CABLE to A2A200
E6380-61111
W125
S/R CABLE to A2A130
E6380-61112
W200
RBN 10CNDCT28AWG
1252-8299
W201
RBN 68CNDCT30AWG
E6380-61015
W202
RBN 40CNDCT28AWG
E6380-61022
W203
CA AY-RIBBON
E6380-61068
W204
CA AY-RBN,HPIB/DCU
E6380-61023
W205
CA AY-RBN
E6380-61052
W210,W211,
W212
RBN 20CNDCT28AWG
E6380-61029
W213
RBN 15CNDCT28AWG
E6380-61028
W214
RBN 20CNDCT28AWG
E6380-61027
W215,W216
RBN 40CNDCT28AWG
E6380-61026
W220,W223
CA AY
E6380-61071
W221
CA AY-RBN,26COND
E6380-61036
W222
CA AY-HARN 20 COND
E6380-61049
Chapter 6
155
Replaceable Parts
Parts List
156
Chapter 6
7
Periodic Adjustments
This chapter contains the periodic adjustment procedures for the Test
Set.
157
Periodic Adjustments
Periodic Adjustments
Periodic Adjustments
Some assemblies or combinations of assemblies require periodic
adjustments to compensate for variations in circuit performance due to
age or environment.
There are two types of calibration data:
• Factory-generated digital data either on memory cards, or on ROMs
(which are on the assemblies themselves)
• Data generated internally by running calibration programs
In either case calibration data is loaded into non-volatile memory on the
A2A31 Controller.
NOTE
Because calibration data resides on the A2A31 Controller assembly, it is
important that whenever the assembly is replaced that the data be
transferred from the original assembly to the new one. The calibration
data resides in a socketed EEPROM which can be moved with little
danger of losing its contents. Refer to the instructions accompanying
the replacement assembly for details.
To download calibration data supplied on a memory card, follow the
instructions that come with the replacement assembly. To create and
download calibration data for assemblies requiring a periodic
adjustment, follow the steps later in this chapter. For a summary of
assemblies and their calibration requirements, see Table 7-1 on page
159.
158
Chapter 7
Periodic Adjustments
Periodic Adjustments
Table 7-1
Assembly Calibration Information
Assembly
Where calibration
data is located.
Memory
Card
Calibration Program:
Sub Program
on
Assembly
A2A80 Audio Analyzer 1
Periodic Calibration:
Audio Analyzer 1 Offset
A2A44 Modulation Distribution
Periodic Calibration:
External Modulation Path
Gain, and, AF GEN Gain
A2A110 Upconverter
X
A2A24 Output Section
X
A2A25 Signal Generator
Synthesizer
X
A2A23 Reference
X
A2A21 Receiver
X
A2A22 Receiver Synthesizer
X
A2A20 Spectrum Analyzer
X
A2A115 Downconverter
A2A33 Measurement
X
X
A2A130 RF Input/Output
A2A200 100 W Attenuator
Periodic Calibration:
Voltmeter References
X
X
System Power Calibration
System Power Calibration
A2A100 CDMA Generator
Reference
A2A31 Controller
Periodic Calibration:
Timebase Reference
IQ Calibration, and
Eb/No Calibration
X
A2A120 LO IF/IQ Modulator
IQ Calibration, and
Eb/No Calibration
A2A34 Data Buffer
IQ Calibration, and
Eb/No Calibration
A2A40 Audio Analyzer 2
Periodic Calibration:
Variable Frequency Notch
Filter
Chapter 7
159
Periodic Adjustments
Periodic Adjustments
Equipment
Equipment for the Periodic Adjustments Programs
• For the Timebase Reference Using a Counter calibration you will
need to connect a frequency counter to the rear-panel 10 MHz REF
OUTPUT connector. The accuracy of the counter will determine the
accuracy of the Test Set’s internal reference. You will use the counter
to set the timebase reference DACs.
• For the Timebase Reference Using a Source calibration you will
need to connect a signal generator to the front-panel ANT IN
connector.
• For the Voltmeter References calibration you will need a DC
voltmeter that can measure ±5 V with ±0.015% accuracy.
Figure 7-1
Periodic Adjustments Menu
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
2
3
4 Help
5 Exit
1
Move the pointer to the desired test using the
knob then press the knob. Press Exit key to
abort.
Periodic Calibration Menu
Periodic
Calibration
Menu
=> Timebase Reference Using a Counter
Timebase Reference Using a Source
Voltmeter References
Audio Frequency Generator Gain
External Modulation Path Gain
Audio Analyzer 1 Offset
Variable Frequency Notch Filter
2
3
4
5 Exit
percal.eps
160
Chapter 7
Periodic Adjustments
Periodic Adjustments
Equipment Needed for the System Power Calibration Program
For the System Power Calibration program you will need the
equipment listed in Table 7-2. Because this calibration program is
written specifically for this equipment, no substitutions are possible.
Table 7-2
Equipment List for System Power Calibration Program
Equipment Type
Model
Signal Generator
Agilent 8648B Option 1EA
Power Meter
Agilent 436A
Agilent 437B
Agilent 438A
Agilent EPM-441A
Agilent EPM-442A
Agilent 8901B
Agilent 8902A
Power Sensor
Agilent 8482A
Agilent ECP-E18A
Agilent 11722A
Power Splitter
Agilent 11667A
GPIB Cables
(2 cables required, 3 if GPIB printer is
used.)
Any GPIB cable
Printer (optional)
Any serial, parallel, or GPIB printer
Chapter 7
161
Periodic Adjustments
A Word About Storing Calibration Factors
A Word About Storing Calibration Factors
You should understand the calibration-factor-storage process before
running any of the following programs: Periodic Calibration, IQ
Calibration, Eb/No Calibration, or System Power Calibration.
As a program runs, calibration factors are computed and applied. When
all the calibration factors have been acquired, the program stops and
asks if the user wants the calibration factors to be stored. At this point,
it should be emphasized that the new calibration factors are now being
used by the Test Set. If you do not store them at this point, they will be
used by the Test Set until the power is switched off even though they
have not been stored.
If you do not store the calibration factors but run another calibration
program and then store the calibration factors, the calibration factors
from the previous program will be stored along with the calibration
factors just acquired unless the power is cycled between the tests.
Storing calibration factors copies the calibration factors from volatile to
non-volatile memory (that is, memory that is not erased when the
power is turned off).
Also, when storing calibration factors, be sure to wait for the message
Updating Flash Calibration Files... DO NOT Interrupt Power! to
disappear before continuing. Depending on the number of calibration
factors being stored, this may take several minutes.
162
Chapter 7
Periodic Adjustments
Running the Periodic, IQ, or Eb/No Calibration Programs
Running the Periodic, IQ, or Eb/No
Calibration Programs
1. Press Menu to access the SOFTWARE MENU screen.
2. Select the field under Select Procedure Location:.
3. Select ROM under the Choices: menu.
4. Select the field under Select Procedure Filename:.
5. Select SERVICE4, see Figure 7-2 on page 163.
6. Select Run Test (key k1).
7. From the SERVICE MENU, select the desired calibration program
to perform.
• Periodic Calibration - for more detailed information, see
“Periodic Calibration Menu Descriptions” on page 165.
• IQ Calibration - for more detailed information, see “IQ
Calibration Program Description” on page 170.
• Eb/No Calibration - for more detailed information, see “Eb/No
Calibration Program Description” on page 171.
8. Follow the instructions on the screen.
Figure 7-2
SERVICE MENU Screen
SOFTWARE MENU Screen
SOFTWARE MENU
1 Run Test
LOAD TEST PROCEDURE:
Select Procedure Location:
ROM
Select Procedure Filename:
SERVICE4
2 Continue
Library:
[NO LIB]
Program:
ROM
Description:
Launches disgnostic and calibration programs.
SERVICE MENU Screen
CUSTOMIZE TEST PROCEDURE:
Freq Channel Information
Parm Test Parameters
Seqn Order of Tests
SERVICE
MENU Limits
Spec Pass/Fail
Save/Delete
Move pointer to theProc
desired
programProcedure
using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
4 Help
SET UP TEST SET:
Exec1 Execution Cond
Cnfg
External Devices
Print
Printerservsrn1.eps
Setup
IBASIC IBASIC Cntrl
2
3
4 Help
5 Exit
servscn2.eps
Chapter 7
163
Periodic Adjustments
Running the System Power Calibration Program
Running the System Power Calibration
Program
This adjustment program is not found in ROM of the Test Set. This
program resides on a PCMCIA Memory Card, part-number
E6380-61811. It has to be downloaded from the memory card.
This program generates system power calibration factors for the Test
Set. The purpose of this program is to generate calibration factors for
the RF Input/Output Section module, high power attenuator, and
cables. This assures that the Test Set will meet its power measurement
accuracy specifications after repair.
An RF signal generator and a power splitter produce two signals with
the same power level. One signal is measured by the power meter, the
other is applied to the input of the Test Set. The program measures
these levels at selected frequencies and then generates calibration
factors so the Test Set readings match the power readings. These
calibration factors are stored in the Test Set.
Communication between the active instrument(s) is through the Test
Set’s GPIB port. An optional printer can be connected to the Test Set’s
GPIB, serial, or parallel port. Typically this is done from the Printer
Setup field of the SOFTWARE menu screen.
To run the System Power Calibration program:
1. Connect GPIB cables from the Test Set to the signal generator and
power meter.
2. Insert the PCMCIA Memory Card, P/N E6380-61811, into the Test
Set’s memory card slot.
3. Press Menu to access the SOFTWARE MENU screen.
4. Select the field under Select Procedure Location:
5. Select Card under the Choices: menu.
6. Select the field under Select Procedure Filename:
7. Select SYSPWR0
8. Select Run Test (key k1).
9. Follow the instructions on the screen.
164
Chapter 7
Periodic Adjustments
Periodic Calibration Menu Descriptions
Periodic Calibration Menu Descriptions
This section describes the adjustment programs listed under the
Periodic Calibration menu.
Figure 7-3
Periodic Calibration
SERVICE MENU Screen
1
SERVICE MENU
Move pointer to desired program using the
knob then press the knob. Press Help for
information on the tests. Press Exit to abort.
=> Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
Eb/No Calibration
2
3
4 Help
5 Exit
1
Move the pointer to the desired test using the
knob then press the knob. Press Exit key to
abort.
Periodic Calibration Menu
Periodic
Calibration
Menu
=> Timebase Reference Using a Counter
Timebase Reference Using a Source
Voltmeter References
Audio Frequency Generator Gain
External Modulation Path Gain
Audio Analyzer 1 Offset
Variable Frequency Notch Filter
2
3
4
5 Exit
percal.eps
Timebase Reference Using a Counter
This program is used to manually tune the timebase reference using a
frequency counter as the time standard. This procedure has two basic
steps:
1. Manual adjustment of the two (coarse and fine) timebase tuning
DACs.
2. Downloading the DAC settings into the Test Set.
If you have not already adjusted the two timebase tuning DACs, exit
the program if needed (by selecting the Adj user key), and follow the
instructions in “Setting the Timebase Latches” on page 169.
If you have adjusted the timebase DACs, run this program and select
the Cal user key to make the setting permanent.
Chapter 7
165
Periodic Adjustments
Periodic Calibration Menu Descriptions
As an alternate method, you can select the option Timebase Reference
Using a Source (see following section) and adjust the timebase to a
time standard connect to the front-panel ANT IN connector.
Timebase Reference Using a Source
This program automatically tunes the timebase tuning DACs to the
signal at the front-panel ANT IN connector, which is input at the
frequency that is keyed in from the front-panel keypad. If an external
10 MHz reference is being used, it must be disconnected.
In order for the calibration to be valid, the signal applied to the ANT IN
connector must have the following characteristics.
1. The level should be between −30 and +20 dBm (0.001 and 100 mW).
2. The frequency should be between 0.4 and 1000 MHz.
3. The frequency must be as accurate as the application of the Test Set
requires.
4. The Test Set must be able to tune to within 10 or 100 kHz of the
reference signal with the Test Set’s current timebase reference
settings. If this condition is not met, either the keyed-in frequency is
incorrect or the Test Set is faulty.
5. The signal must be a CW signal. Specifically, any FM must be less
than 100 Hz peak as measured by the Test Set.
6. The coarse tune DAC must be between 3 and 250 (decimal);
otherwise, the frequency of the source is out of reach by the tuning
DAC.
After the coarse and fine tune DAC settings have been determined, the
values are downloaded into the Test Set’s memory.
Voltmeter References
When you select the Voltmeter Reference calibration, instructions are
displayed explaining how to measure the negative and positive
references with an external voltmeter. The user is required to key in the
readings. If the readings are within range, the two values are
automatically downloaded.
For the Test Set to meet published specifications, the external DC
voltmeter must be ±0.015% accurate when measuring ±5 V. The
voltmeter is connected to the test points on the Measurement board,
A2A33 assembly, see Figure 7-4 on page 167.
166
Chapter 7
Periodic Adjustments
Periodic Calibration Menu Descriptions
Figure 7-4
Measurement (A2A33) Assembly Test Points
Measurement Board Assembly
+REF
SGND
-REF
a2a33_1.eps
Audio Frequency Generator Gain
The gain of the following paths is calibrated:
• The internal paths that run from Audio Frequency Generators 1 and
2 (individually) through the Modulation Distribution assembly, to
the monitor select output, then onto Audio Analyzer 1 to the DVM.
• The paths that run from Audio Frequency Generators 1 and 2
(individually) through the Modulation Distribution assembly to the
AUDIO OUT connector, externally to the rear-panel MODULATION
IN connector, then again through the Modulation Distribution
assembly to the monitor select output and to the DVM.
The above-measured levels are used to adjust the output level of the
audio generators so that they produce a calibrated level to the
modulation inputs of the RF generator. These measurements are made
at DC. Both positive and negative levels are measured to produce an
optimum calibration factor.
Chapter 7
167
Periodic Adjustments
Periodic Calibration Menu Descriptions
External Modulation Path Gain
The Audio Frequency Generator Gain program should be performed
before running the External Modulation Path Gain program.
The “path” in this program runs from the external MODULATION IN
connector through the Modulation Distribution assembly, through the
Monitor Select Switch, and then through Audio Analyzer 1 to the Test
Set’s internal DVM. The dc source is Audio Frequency Generator 1
through the AUDIO IN connector and an external cable.
The goal of this procedure is to set the External Level Amplifier gain
DAC (on the Modulation Distribution assembly) to produce a gain of
exactly 4 between the MODULATION IN connector and output of the
Monitor Select Switch. This requires measuring the input and output
levels, calculating the gain, changing the DAC setting, and then
repeating the process until the calculated gain equals 4.
Audio Analyzer 1 Offset
Two DC offsets are measured and downloaded as calibration factors to
the Audio Analyzer 1 assembly. These measurements are determined
under the following conditions:
• Input-select switch grounded
• AUDIO INPUT selected with return conductor grounded
Variable Frequency Notch Filter
The calibration factors for tuning the variable-frequency notch filter are
determined as follows:
The input to the filter is set to 10 evenly-spaced frequencies between
300 and 10,000 Hz. The DAC that tunes the notch filter is adjusted for
best null of the tune error voltage. From this data, three coefficients of a
parabola which best fit the tuning data are calculated using a
least-squares curve fit. The coefficients are then automatically
downloaded into the Test Set’s non-volatile memory.
168
Chapter 7
Periodic Adjustments
Setting the Timebase Latches
Setting the Timebase Latches
The refs_DAC_coarse and ref_DAC_fine values adjust the frequency
of the Test Set’s internal 10 MHz reference. They are stored in memory.
The controller reads the values and sends the appropriate adjustment
to the A2A23 Reference assembly.
The following procedure is to be used when running the program
“Timebase Reference Using a Counter” on page 165.
1. Press Shift, Duplex Config to access the CONFIGURE screen.
2. Select SERVICE under the To Screen menu.
3. Connect a frequency counter to the rear-panel 10 MHz REF
OUTPUT connector.
4. Select the Latch field.
5. Select refs_DAC_coarse under the Choices: menu.
6. Select the Value field.
7. Rotate the knob until the counter reads as close to 10 MHz as
possible.
8. Select the Latch field.
9. Select refs_DAC_fine under the Choices: menu.
10.Select the Value field.
11.Rotate the knob until the counter reads as close to 10 MHz as
possible.
12.Store the new DAC values (timebase calibration data) in non-volatile
memory by selecting and running the Timebase Reference Using
a Counter routine from the Periodic Calibration Menu. See
“Timebase Reference Using a Counter” on page 165.
Chapter 7
169
Periodic Adjustments
IQ Calibration Program Description
IQ Calibration Program Description
The goal of IQ Calibration is to minimize the carrier feedthrough while
maximizing the Rho of the IQ signal. There are four DACs involved in
this adjustment:
• buffModN_I_DC_offset_DAC,
• buffModN_Q_DC_offset DAC,
• buffModN_signal_delta_DAC,
• genRef_IQ_quad_DAC
The I and Q dc offset DACs and the signal delta DAC are on the A2A34
Data Buffer assembly and the Quad DAC is on the A2A100 CDMA
Generator Reference. These DACs can be accessed in the list of Latches
on the SERVICE screen. All the DACs are initially set to 127 before
starting the calibration adjustment, and the calibration is carried out at
several equally spaced frequencies between 800 and 1000 MHz.
The instrument is set into a CDMA loopback mode and the calibration
is carried out by first adjusting the I and Q dc offset DACs while
monitoring the carrier feedthrough (CFT). Both CFT and rho are
measured by the A2A36 Receive DSP. Once the CFT is minimized
(through an iterative process), the signal delta and the quad DACs are
adjusted while monitoring rho. When rho is maximized (again through
an iterative process), the calibration adjustment is complete. At power
down, each DAC setting at each frequency is downloaded to the
calibration ROM on the A2A31 Controller assembly.
Figure 7-5
IQ Calibration
SOFTWARE MENU Screen
SOFTWARE MENU
1 Run Test
LOAD TEST PROCEDURE:
Select Procedure Location:
ROM
Select Procedure Filename:
SERVICE4
SERVICE MENU Screen
2 Continue
Library:
[NO LIB]
Program:
ROM
Description:
Launches disgnostic and calibration programs.
1
CUSTOMIZE TEST PROCEDURE:
Freq Channel Information
SERVICE MENU
Parm Test Parameters
2
Seqn Order of Tests
Move pointer to the desired program
using the
Spec Pass/Fail Limits
knob then press the knob. Press
HELP
for
Proc Save/Delete Procedure
information on the tests. Press EXIT to abort.
4 Help
SET UP TEST SET:
Exec Execution Cond
Cnfg
External Devices
Print
Printerservsrn1.eps
Setup
IBASIC IBASIC Cntrl
3
iqcal1.eps
Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
=> IQ Calibration
Eb/No Calibration
170
4 Help
5 Exit
Chapter 7
Periodic Adjustments
Eb/No Calibration Program Description
Eb/No Calibration Program Description
The Eb/No calibration is a CDMA loopback measurement. Before the
Eb/No measurement begins, four preliminary measurements are made
with the CDMA generator in the data mode: (1) The difference in
channel power between forward and reverse modes is measured to
determine the loss to be accounted for when the all-pass filter is in
forward mode. (2) Rho is measured in both the forward and reverse
paths. (3) The time offset is measured and its value entered. (4) Fast
power is measured to assure that the signal is “noiseless.”
The generator is then set to the Eb/No mode at values of 7, 10, 12, 14,
16, 18, and 20 dB, and one hundred measurements of fast power are
made at each value. (This takes several minutes to complete.) The
measured data is then processed and converted into calibration factors.
Figure 7-6
Eb/No Calibration
SOFTWARE MENU Screen
SOFTWARE MENU
1 Run Test
LOAD TEST PROCEDURE:
Select Procedure Location:
ROM
Select Procedure Filename:
SERVICE4
SERVICE MENU Screen
2 Continue
Library:
[NO LIB]
Description:
Launches disgnostic and calibration programs.
1
CUSTOMIZE TEST PROCEDURE:
Freq Channel Information
SERVICE MENU Parm Test Parameters
Seqn Order of Tests 2
Move pointer to the desired program
the Limits
Specusing
Pass/Fail
Procedure
knob then press the knob. Press Proc
HELP Save/Delete
for
information on the tests. Press EXIT to abort.
Functional Diagnostics
AF Diagnostics
RF Diagnostics
CDMA Diagnostics
Edit RF Diagnostic Limits
Periodic Calibration
IQ Calibration
=> Eb/No Calibration
Chapter 7
Program:
ROM
3
4 Help
SET UP TEST SET:
Exec Execution Cond
Cnfg
External Devices
Print
Printerservsrn1.eps
Setup
IBASIC IBASIC Cntrl
ebno1.eps
4 Help
5 Exit
171
Periodic Adjustments
Eb/No Calibration Program Description
172
Chapter 7
8
Performance Tests
This chapter contains the performance test procedures for the Test Set.
The tests in this chapter verify that the Test Set performs to its
published specifications.
173
Performance Tests
Procedure and Equipment
Procedure and Equipment
How to Use the Performance Tests
• Run the Performance Tests in Table 8-2, “Performance Tests &
Records Location,” on page 176 using the specified Test Equipment
from Table 8-1, “Required Test Equipment by Model,” on page 175.
• Compare and record the data for each test onto the applicable
Performance Test Record (PTR). Table 8-2, “Performance Tests &
Records Location,” on page 176 shows the page number of the PTR
associated with each performance test.
Test Set Operation
To perform the following performance test procedures you need to know
basic Test Set operation. You should be familiar with the front panel,
the various display screens, and knob operation (cursor control). You
should be able to operate the Test Set’s RF generator, RF analyzer, AF
generators, AF analyzer, spectrum analyzer, and oscilloscope.
NOTE
Press Preset on the Test Set before beginning each test.
Test Equipment and Operation
The test equipment shown in Table 8-1, “Required Test Equipment by
Model,” on page 175 is needed to do all of the performance tests.
Usually, a setup drawing at the beginning of each test procedure shows
the equipment and hook-up needed for that particular test. Generic
names are used for the test equipment shown in the setup drawings.
To find alternatives to the equipment listed in Table 8-1 on page 175,
look up their specifications in the Agilent Technologies Test and
Measurement Catalog and use the specifications to find equivalent
instruments.
The test procedures give critical instrument settings and connections,
but they don’t tell how to operate the instruments. Refer to each
instrument’s operating manual.
174
Chapter 8
Performance Tests
Procedure and Equipment
Table 8-1
Required Test Equipment by Model
Model Number
Model Name
Test Number
Mini-Circuits
ZFL-2000 or
equivalent1
Amplifier 1
5
GTC RF Products GRF
5016 or equivalent2
Amplifier 2
27, 28
Agilent 3458A
Multimeter
8-9, 12, 15, 18
Agilent 5316A
Counter
11, 16
Agilent 8562A
Spectrum Analyzer
6-7
Agilent 8663A
Signal Generator (High Performance)
4
Agilent 8648B Option
1EA
Signal Generator
19
Agilent 8902A
Measuring Receiver
1-5, 17, 19-22, 25, 27,
28
Agilent 8903B
Audio Analyzer
4, 10, 12, 16, 18, 20-22
Agilent 11667A
Power Splitter
19, 27, 28
Agilent 11715A
AM/FM Test Source
20-23
Agilent 11722A
Sensor Module
5, 19, 25, 27, 28
Agilent 11793A
Microwave Converter
1-5
Agilent E4420B
Signal Generator
1-5, 24, 27, 28
Agilent E6380-618113
System Power Calibration Program
Software Kit
19
Agilent 89441A with
options AYA, AY9,
UFG
Vector Signal Analyzer
26, 29
1. Required amplifier specifications are frequency range 1.7 to 2.0 GHz, gain >18
dB, noise figure <5 dB. For more information about Mini-Circuits, contact them
at (718) 934-4500 or http://www.minicircuits.com.
2. Required amplifier specifications are frequency range 1.0 to 2.0 GHz, gain of
43 dB, output power of +20 dBm. For more information about GTC, contact
them at (310) 673-8422 or GTC@primenet.com.
3. To order the System Power Calibration Card see “Ordering Parts” on page 46.
Chapter 8
175
Performance Tests
Procedure and Equipment
Table 8-2
Performance Tests & Records Location
Performance Test
(in this chapter)
Test Record
in Chapter 7 ,
“Periodic
Adjustments,
” on page 157
“RF Generator FM Distortion Performance Test 1” on page 178
page 234
“RF Generator FM Accuracy Performance Test 2” on page 181
page 236
“RF Generator FM Flatness Performance Test 3” on page 184
page 238
“RF Generator Residual FM Performance Test 4” on page 187
page 240
“RF Generator Level Accuracy Performance Test 5” on page 190
page 242
“RF Generator Harmonics Spectral Purity Performance Test 6” on page 195
page 250
“RF Generator Spurious Spectral Purity Performance Test 7” on page 196
page 254
“AF Generator AC Level Accuracy Performance Test 8” on page 197
page 256
“AF Generator DC Level Accuracy Performance Test 9” on page 198
page 258
“AF Generator Residual Distortion Performance Test 10” on page 199
page 259
“AF Generator Frequency Accuracy Performance Test 11” on page 200
page 261
“AF Analyzer AC Level Accuracy Performance Test 12” on page 201
page 262
“AF Analyzer Residual Noise Performance Test 13” on page 202
page 263
“AF Analyzer Distortion and SINAD Accuracy Performance Test 14” on page
203
page 264
“AF Analyzer DC Level Accuracy Performance Test 15” on page 204
page 265
“AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16” on page
205
page 266
“AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17” on page
206
page 267
“Oscilloscope Amplitude Accuracy Performance Test 18” on page 208
page 268
“RF Analyzer Level Accuracy Performance Test 19” on page 210
page 269
“RF Analyzer FM Accuracy Performance Test 20” on page 211
page 271
“RF Analyzer FM Distortion Performance Test 21” on page 213
page 273
“RF Analyzer FM Bandwidth Performance Test 22” on page 215
page 273
“RF Analyzer Residual FM Performance Test 23” on page 217
page 274
“Spectrum Analyzer Image Rejection Performance Test 24” on page 219
page 275
“CDMA Generator Amplitude Level Accuracy Performance Test 25” on page
221
page 277
176
Chapter 8
Performance Tests
Procedure and Equipment
Table 8-2
Performance Tests & Records Location
Performance Test
(in this chapter)
Test Record
in Chapter 7 ,
“Periodic
Adjustments,
” on page 157
“CDMA Generator Modulation Accuracy Performance Test 26” on page 223
page 278
“CDMA Analyzer Average Power Level Accuracy Performance Test 27” on
page 225
page 279
“CDMA Analyzer Channel Power Level Accuracy Performance Test 28” on
page 227
page 280
“CDMA Analyzer Modulation Accuracy Performance Test 29” on page 229
page 281
Chapter 8
177
Performance Tests
RF Generator FM Distortion Performance Test 1
RF Generator FM Distortion
Performance Test 1
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-1, “RF
Generator FM Distortion Test 1 Record,” on page 234. The FM
distortion of the RF generator is measured directly by the measuring
receiver. The Test Set’s internal audio generator provides the
modulation source.
Two setups are shown below. The first setup can measure signals to 1
GHz. Since the FM generator in the Test Set translates FM in the lower
band directly into the 1.7 to 2 GHz range, testing to 1 GHz is adequate
when verifying a repair. The second setup has a microwave converter
which covers the full measurement range of FM signals to 2 GHz.
NOTE
Initial Setup
Figure 8-1
Setup for Measurements to 1 GHz
Measuring Receiver
INPUT 50Ω
Figure 8-2
DUPLEX OUT
Setup for Measurements to 2 GHz Using a Microwave Converter
Measuring Receiver
INPUT 50Ω
DUPLEX OUT
Microwave Converter
Signal Generator
RF INPUT
IF OUTPUT
LO INPUT
178
RF OUTPUT
Chapter 8
Performance Tests
RF Generator FM Distortion Performance Test 1
Procedure
Steps 1, 2, and 3 in the following procedure apply to both of the setups
(shown in Figure 8-1 and Figure 8-2 on page 178).
1. On the measuring receiver:
a. Reset the instrument.
b. Set the high-pass filter to 300 Hz.
c. Set the low-pass filter to 3 kHz.
d. Set the measurement mode to FM.
e. Set the measurement mode to audio distortion.
f. If the microwave converter is being used, set the frequency offset
mode to exit the mode (27.0 Special).
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 10 MHz.
h. Set the Amplitude to -10 dBm.
i. Set the AFGen1 To field to FM at 99 kHz deviation with the FM set
to On.
3. For frequencies up to 1000 MHz measure the FM distortion (audio
distortion) at the RF frequencies and deviations shown in the
Performance Test Record (PTR) and compare the measured
distortion to the limits.
The following steps are for measurements to 2 GHz.
4. On the signal generator:
a. Set the frequency to 1500 MHz CW.
b. Set the level to +8 dBm or whatever level is suitable for the
microwave converter’s LO input.
Chapter 8
179
Performance Tests
RF Generator FM Distortion Performance Test 1
5. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO
frequency (27.3 Special).
b. Key in the LO frequency (in MHz) which is 1500.
6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the
FM distortion at the deviations shown in the PTR and compare the
measured distortion to the limits.
180
Chapter 8
Performance Tests
RF Generator FM Accuracy Performance Test 2
RF Generator FM Accuracy
Performance Test 2
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-2, “RF
Generator FM Accuracy Test 2 Record,” on page 236. The FM accuracy
of the RF generator is measured directly by the measuring receiver. The
Test Set's internal audio generator provides the modulation source.
Two setups are shown below. The first setup can measure signals to 1
GHz. Since the FM generator in the Test Set translates FM in the lower
band directly into the 1.7 to 2 GHz range, testing to 1 GHz is adequate
when verifying a repair. The second setup has a microwave converter
which covers the full measurement range of FM signals to 2 GHz.
NOTE
Initial Setup
Figure 8-3
Setup for Measurements to 1 GHz
Measuring Receiver
INPUT 50Ω
Figure 8-4
DUPLEX OUT
Setup for Measurements to 2 GHz Using a Microwave Converter
Measuring Receiver
INPUT 50Ω
DUPLEX OUT
Microwave Converter
Signal Generator
RF INPUT
IF OUTPUT
LO INPUT
Chapter 8
RF OUTPUT
181
Performance Tests
RF Generator FM Accuracy Performance Test 2
Procedure
Steps 1, 2, and 3 in the following procedure apply to both of the setups
(shown in Figure 8-3 and Figure 8-4 on page 181).
1. On the measuring receiver:
a. Reset the instrument.
b. Set the high-pass filter to 300 Hz.
c. Set the low-pass filter to 3 kHz.
d. Set the measurement mode to FM.
e. Set the FM de-emphasis off.
f. If the microwave converter is being used, set the frequency offset
mode to exit the mode (27.0 Special).
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 10 MHz.
h. Set the Amplitude to -10 dBm.
i. Set the AFGen1 To field to FM at 99 kHz deviation with the FM set
to On.
3. For frequencies up to 1000 MHz measure the FM deviation at the RF
frequencies and deviations shown in the Performance Test Record
(PTR) and compare the measured deviation to the limits.
The following steps are for measurements to 2 GHz.
4. On the signal generator:
a. Set the frequency to 1500 MHz CW.
b. Set the level to +8 dBm or whatever level is suitable for the
microwave converter’s LO input.
182
Chapter 8
Performance Tests
RF Generator FM Accuracy Performance Test 2
5. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO
frequency (27.3 Special).
b. Key in the LO frequency (in MHz) which is 1500.
6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the
FM at the deviations shown in the PTR and compare the measured
deviation to the limits.
Chapter 8
183
Performance Tests
RF Generator FM Flatness Performance Test 3
RF Generator FM Flatness
Performance Test 3
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-3, “RF
Generator FM Flatness Test 3 Record,” on page 238. The FM flatness of
the RF generator is measured directly by the measuring receiver. The
Test Set's internal audio generator provides the modulation source.
Two setups are shown below. The first setup can measure signals to 1
GHz. Since the FM generator in the Test Set translates FM in the lower
band directly into the 1.7 to 2 GHz range, testing to 1 GHz is adequate
when verifying a repair. The second setup has a microwave converter
which covers the full measurement range of FM signals to 2 GHz.
NOTE
Initial Setup
Figure 8-5
Setup for Measurements to 1 GHz
Measuring Receiver
INPUT 50Ω
Figure 8-6
DUPLEX OUT
Setup for Measurements to 2 GHz Using a Microwave Converter
Measuring Receiver
INPUT 50Ω
DUPLEX OUT
Microwave Converter
Signal Generator
RF INPUT
IF OUTPUT
LO INPUT
184
RF OUTPUT
Chapter 8
Performance Tests
RF Generator FM Flatness Performance Test 3
Procedure
Steps 1, 2, and 3 in the following procedure apply to both of the setups
(shown in Figure 8-5 and Figure 8-6 on page 184).
1. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. If the microwave converter is being used, set the frequency offset
mode to exit the mode (27.0 Special).
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 521 MHz.
h. Set the Amplitude to -10 dBm.
i. Set the AFGen1 To field to FM at 50 kHz deviation with the FM set
to On.
3. For frequencies up to 1000 MHz measure the FM deviation at the RF
frequencies and rates shown in the Performance Test Record (PTR).
Convert the measurement results to dB referenced to the deviation
measured at 1 kHz using the following formula and compare the
calculated deviation to the limits in the PTR.
Equation 8-1
Deviation
dB = 20 • log  ---------------------------------------------
Deviation at 1 kHz
The following steps are for measurements to 2 GHz.
4. On the signal generator:
a. Set the frequency to 1500 MHz CW.
b. Set the level to +8 dBm or whatever level is suitable for the
microwave converter’s LO input.
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5. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO
frequency (27.3 Special).
b. Key in the LO frequency (in MHz) which is 1500.
6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the
FM deviation at the rates shown in the PTR. Convert the
measurement results as was done in step 3 and compare the
calculated deviation to the limits.
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RF Generator Residual FM Performance Test 4
RF Generator Residual FM
Performance Test 4
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-4, “RF
Generator Residual FM Test 4 Record,” on page 240. The residual FM
of the RF generator is measured directly by the measuring receiver. An
external LO is used to improve the residual FM of the measuring
receiver. An audio analyzer with a CCITT psophometric filter is
required to measure the demodulated FM.
Two setups are shown below and on the following page. The first setup
is capable of measuring signals to 1 GHz. The second setup has a
microwave converter which covers the full measurement range of FM
signals to 2 GHz. The microwave converter’s LO must be a low residual
FM synthesizer.
NOTE
Initial Setup
Figure 8-7
Setup for Measurements to 1 GHz
Audio Analyzer
INPUT
Measuring Receiver
DUPLEX OUT
MODULATION OUTPUT
EXT LO
INPUT
INPUT 50Ω
Signal Generator
RF OUTPUT
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Figure 8-8
Setup for Measurements to 2 GHz Using a Microwave Converter
Audio Analyzer
INPUT
Measuring Receiver
DUPLEX OUT
MODULATION OUTPUT
EXT LO
INPUT
RF
INPUT
Signal Generator
INPUT 50Ω
Signal Generator LO
IF OUTPUT
Microwave
Converter
RF
OUTPUT
LO
INPUT
RF
OUTPUT
Procedure
Steps 1 to 5 in the following procedure apply to both setups (shown in
Figure 8-7 and Figure 8-8 on page 188).
1. On the signal generator (to be used as the measuring receiver’s LO):
a. Set the frequency to 11.5 MHz.
b. Set the level to 0 dBm.
2. On the measuring receiver:
a. Reset the instrument.
b. Set the IF to 1.5 MHz (3.2 Special).
c. Set the high-pass filter to 50 Hz.
d. Set the low-pass filter to 15 kHz.
e. Set the measurement mode to FM.
f. If the instrument has an external LO switch, enable the external
LO mode (23.1 Special).
g. If the microwave converter is being used, set the frequency offset
mode to exit the mode (27.0 Special).
3. On the audio analyzer:
a. Reset the instrument.
b. Set the measurement mode to AC level.
c. Select the CCITT Weighting filter.
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d. Set the low-pass filter to 30 kHz.
4. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 10 MHz.
h. Set the Amplitude to -10 dBm.
5. For frequencies up to 1000 MHz and for each line in the Performance
Test Record (PTR) do the following:
a. Set the signal generator (used as an LO for the measuring
receiver) to the LO frequency shown in the PTR.
b. Set the Test Set to the RF frequencies shown in the PTR.
c. Measure the ac level (in mV) on the audio analyzer.
d. Multiply the measured ac levels by 1000 to convert them to FM
deviation in Hz and compare the computed results to the limits
shown in the PTR.
The following steps are for measurements to 2 GHz.
6. On the signal generator:
a. Set the frequency to 1500 MHz CW for 1700 MHz, 1800 MHz CW
for 2000 MHz.
b. Set the level to +8 dBm or whatever level is suitable for the
microwave converter’s LO input.
7. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO
frequency (27.3 Special).
b. Key in the LO frequency (in MHz) which is 1500 MHz.
8. On the Test Set, for frequencies of 1700 and 2000 MHz, continue on
as in step 5.
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RF Generator Level Accuracy Performance Test 5
RF Generator Level Accuracy
Performance Test 5
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-5, “RF
Generator Level Accuracy Test 5 Record,” on page 242. Using a
measuring receiver and sensor module, at several frequencies up to 1
GHz the Test Set is set to generate levels between −10 and 125 dBm (in
5 dB steps) at it’s DUPLEX OUT connector. The level is measured with
the tuned RF level feature of the measuring receiver. At each frequency
the measuring receiver connection is moved to the RF IN/OUT and the
level measured from -40 to −125 dBm. As the test proceeds you may be
required to recalibrate the measuring receiver.
To extend the measurement frequency to 2 GHz the second method uses
a microwave converter and amplifier to extend the measurement range
(see Figure 8-10 on page 192).
Figure 8-9
Setup 1 for Measurements to 1 GHz
Measuring Receiver
SENSOR
INPUT 50Ω
DUPLEX OUT
RF IN/OUT
Sensor Module
Procedure 1
Steps 1 to 5 in the following procedure apply to Setup 1 shown in Figure
8-9 on page 190.
1. Before connecting the test set to the measuring receiver:
a. Reset the instrument.
b. Zero and calibrate the sensor module.
NOTE
Make sure the sensor module’s calibration data is entered into the
measuring receiver.
2. Connect the equipment as shown in Setup 1 whether intending to
measure frequencies to 1 GHz or 2 GHz.
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3. On the measuring receiver:
a. Set the measurement mode to RF Power.
b. Set the display to log.
4. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 3 MHz.
h. Set the Amplitude to -10 dBm.
5. For each frequency in the Performance Test Record (PTR) do the
following:
a. Set the measuring receiver to measure frequency.
b. Set the Test Set level to −10 dBm.
c. After the measuring receiver has acquired the signal, set the
measuring receiver to measure tuned RF level.
d. Measure the RF level at the levels shown in the PTR at the Test
Set's DUPLEX OUT port and compare the measured RF level to
the limits. If the measuring receiver displays the need to
recalibrate, press the CALIBRATE key and wait for calibration to
be completed.
e. Move the sensor module to the Test Set's RF IN/OUT port.
f. On the Test Set set the Output Port field to RF Out and repeat
the measurements for the levels shown in the PTR and compare
the measured RF level to the limits.
g. Move the sensor module back to the Test Set's DUPLEX OUT port
and set the Output Port to Dupl.
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Figure 8-10
Setup 2 for Measurements of 1700 and 2000 MHz
DUPLEX OUT
RF IN/OUT
INPUT
AMPLIFIER 1
OUTPUT
Measuring Receiver
Microwave
Converter
RF
INPUT
Signal Generator
INPUT 50Ω
IF OUTPUT
LO
INPUT
RF
OUTPUT
Procedure 2
Steps 1 to 5 in the following procedure apply to Setup 1 shown in Figure
8-9 on page 190.
1. Connect the sensor module on the measuring receiver to the
DUPLEX OUT port of the Test Set.
2. On the Test Set:
a. Set the Amplitude to -10 dBm.
b. Set the RF Gen Freq to 1700 MHz.
3. On the measuring receiver:
a. Set the measurement mode to RF power.
b. Key in 1700 MHz.
c. Measure and record the RF power at the DUPLEX OUT port.
4. On the Test Set set the RF Gen Freq to 2000 MHz.
5. On the measuring receiver:
a. Key in 2000 MHz.
b. Measure and record the RF power at the DUPLEX OUT port.
Steps 6 to 8 apply to Setup 2 shown in Figure 8-10 on page 192.
6. Make the connections shown in Setup 2.
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7. On the signal generator set the level to +8 dBm or whatever level is
suitable for the microwave converter’s LO input.
8. For frequencies of 1700 and 2000 MHz perform the following:
a. On the signal generator set the frequency to 1900 MHz CW and
2200 MHz CW respectively.
b. Reset the measuring receiver.
c. On the measuring receiver set the frequency offset mode to enter
and enable the LO frequency (27.3 Special) then key in the signal
generator (LO) frequency (in MHz) which is 1900 or 2200 MHz
respectively.
d. On the measuring receiver set the measurement mode to tuned
RF level and the measurement units to dBm then press SET REF.
e. Measure and record the RF level at the levels down to and
including -80 dBm shown in the PTR at the Test Set's DUPLEX
OUT port. If the measuring receiver displays the need to
recalibrate, press the CALIBRATE key and wait for calibration to
be completed.
f. After recording the reading at -80 dBm insert an RF amplifier
into the output of the Test Set.
g. Record the new measured level at -80 dBm.
h. Continue measuring the level down to -125 dBm.
i. Move the input to the microwave converter to the RF IN/OUT
port without the amplifier inserted.
j. Measure and record the RF level at the levels down to and
including -80 dBm shown in the PTR at the Test Set's RF IN/OUT
port.
k. After recording the reading at -80 dBm insert an RF amplifier
into the output of the Test Set.
l. Record the new measured level at -80 dBm.
m. Continue measuring the level down to -125 dBm.
n. Correct the measured reading for each level measured without
the amplifier as follows: Add the RF power measured in step 3c or
5b to the measured level. (For example, if the level in step 3c is
-10.2 dBm and the level at -55 dBm is -45.1 dB, record a level of
-10.2 + (-45.1) = 55.3 dBm.) Compare the corrected values with
the limits in the PTR.
o. Correct the measured reading for each level measured with the
amplifier by summing the following values:
+ RF power measured at -10 dBm in step 3c or 5b
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+ RF level measured at -80 dBm in step 8i
– RF level measured at -80 dBm in step 8j
+ RF level measured in step 8k
For example, if:
RF power measured at −10 dBm in step 3b or 5b = −10.2 dBm
RF level measured at −80 dBm in step 8i = −70.1 dB
RF level measured at -80 dBm in step 8j = −52.6 dB
RF level measured at -100 dBm in step 8k = −73.2 dB the
corrected level at −100 dBm is −10.2 + (−70.1) − (−52.6) + (−73.2) =
100.9 dBm. Compare the corrected values with the limits in the
PTR.
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RF Generator Harmonics Spectral Purity Performance Test 6
RF Generator Harmonics Spectral Purity
Performance Test 6
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-6, “RF
Generator Harmonics Spectral Purity Test 6 Record,” on page 250.
Harmonic signals with the carrier set to several frequencies and two
different levels (maximum output and minimum level vernier) are
searched for by an RF spectrum analyzer.
Figure 8-11
Setup
Spectrum Analyzer
INPUT 50Ω
DUPLEX OUT
Procedure
1. Set up the spectrum analyzer in accordance with its operating
manual.
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 1 MHz.
h. Set the Amplitude to -10 dBm.
3. Set the test set’s RF generator to the frequencies and levels shown in
the Performance Test Record (PTR) and measure the second and
third harmonics. For each measurement convert the harmonic level
to dB below the fundamental (dBc) and compare the computed levels
to the limits.
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RF Generator Spurious Spectral Purity Performance Test 7
RF Generator Spurious Spectral Purity
Performance Test 7
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-7, “RF
Generator Spurious Spectral Purity Test 7 Record,” on page 254.
Spurious signals with the carrier set to several frequencies and two
different levels (maximum output and minimum level vernier) are
searched for by an RF spectrum analyzer.
Figure 8-12
Setup
Spectrum Analyzer
INPUT 50Ω
DUPLEX OUT
Procedure
1. Set up the spectrum analyzer in accordance with its operating
manual.
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 242 MHz.
h. Set the Amplitude to -10 dBm.
3. Set the test set’s RF generator to the frequencies and levels shown in
the Performance Test Record (PTR) and measure the level of the
spurious signals at the frequencies shown. For each measurement
convert the harmonic level to dB below the fundamental (dBc) and
compare the computed levels to the limits.
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AF Generator AC Level Accuracy Performance Test 8
AF Generator AC Level Accuracy
Performance Test 8
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-8, “AF
Generator AC Level Accuracy Test 8 Record,” on page 256. There are
two audio generators. AC level accuracy is measured directly with a
digital multi meter.
Figure 8-13
Setup
AUDIO OUT
Multimeter
INPUT
Procedure
1. Set the multimeter to measure AC volts.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance
Test Record (PTR) and measure the AC level. Compare the
measured voltage to the limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to
On.
b. Set the audio frequency and level as shown in the PTR and
measure the AC level. Compare the measured voltage to the
limits.
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AF Generator DC Level Accuracy Performance Test 9
AF Generator DC Level Accuracy
Performance Test 9
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-9, “AF
Generator DC Level Accuracy Test 9 Record,” on page 258. There are
two DC generators. DC level accuracy is measured directly with a
digital multi meter.
Figure 8-14
Setup
AUDIO OUT
Multimeter
INPUT
Procedure
1. Set the multimeter to measure DC volts.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
d. Set the AFGen1 Freq and AFGen2 Freq fields to 0.0 Hz.
e. Set the Audio Out field to DC.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance
Test Record (PTR) and measure the DC level. Compare the
measured voltage to the limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to
on.
b. Set the audio frequency and level as shown in the PTR and
measure the DC level. Compare the measured voltage to the
limits.
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AF Generator Residual Distortion Performance Test 10
AF Generator Residual Distortion
Performance Test 10
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-10, “AF
Generator Residual Distortion Test 10 Record,” on page 259. Audio
distortion is measured directly with an audio analyzer.
Figure 8-15
Setup
AUDIO OUT
Audio Analyzer
INPUT
Procedure
1. On the audio analyzer:
a. Reset the instrument.
b. Select the 80 kHz low-pass filter.
c. Set the measurement mode to distortion.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance
Test Record (PTR) and measure the audio distortion. Compare
the measured distortion to the limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to
on.
b. Set the audio frequency and level as shown in the PTR and
measure the audio distortion. Compare the measured distortion
to the limits.
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AF Generator Frequency Accuracy Performance Test 11
AF Generator Frequency Accuracy
Performance Test 11
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-11, “AF
Generator Frequency Accuracy Test 11 Record,” on page 261.
Frequency accuracy is measured directly with a frequency counter. The
counter must be able to resolve 0.005% at 20 Hz.
Figure 8-16
Setup
AUDIO OUT
Counter
INPUT
Procedure
1. Set the counter to measure frequency.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance
Test Record (PTR) and measure the audio frequency. Compare the
measured frequency to the limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to
on.
b. Set the audio frequency and level as shown in the PTR and
measure the audio frequency. Compare the measured frequency
to the limits.
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AF Analyzer AC Level Accuracy Performance Test 12
AF Analyzer AC Level Accuracy
Performance Test 12
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-12, “AF
Analyzer AC Voltage Accuracy Test 12 Record,” on page 262. To
measure AC voltage accuracy, an AC signal is measured by an external
multi meter and compared to the Test Set’s internal AC voltmeter
reading.
Figure 8-17
Setup
AUDIO IN HI
Audio Analyzer
OUTPUT
Multimeter
INPUT
Procedure
1. Set the digital multimeter to measure AC volts.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 2 field to >99kHz LPF.
e. Set the Audio In Lo field to Gnd.
f. Set the Detector field to RMS.
g. Set the Settling field to Slow.
3. Set the audio analyzer’s source to the frequencies and levels shown
in the Performance Test Record. (Adjust the level until the digital
multimeter reads the correct level.)
4. Measure the AC level on the Test Set and compare the measured
level to the limits.
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AF Analyzer Residual Noise Performance Test 13
AF Analyzer Residual Noise
Performance Test 13
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-13, “AF
Analyzer Residual Noise Test 13 Record,” on page 263. The AC level of
the audio input is measured with no signal source connected.
Figure 8-18
Setup
Procedure
1. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 2 field to 15kHz LPF.
e. Set the Audio In Lo field to Gnd.
f. Set the Detector field to RMS.
2. Measure the AC level (residual noise) on the Test Set and compare
the measured level to the limits shown in the Performance Test
Record.
3. Set the Filter 2 field to >99kHz LP.
4. Measure the AC level (residual noise) on the Test Set and compare
the measured level to the limits shown in the Performance Test
Record.
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AF Analyzer Distortion and SINAD Accuracy Performance Test 14
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-14, “AF
Analyzer Distortion and SINAD Accuracy Test 14 Record,” on page 264.
A calibrated distortion source is created by summing the two internal
audio generators. Levels are measured separately by the internal AC
voltmeter. One source is set to a harmonic two or three times the
frequency of the other. The measured distortion and SINAD is
compared with the calculated value.
Figure 8-19
Setup
AUDIO OUT
AUDIO IN HI
Procedure
1. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Audio In Lo field to Gnd.
e. Set the Detector field to RMS.
f. Select the RF GENERATOR screen.
g. Set the AFGen1 To field to Audio Out.
h. Set the AFGen1 To level field to 1.00 V.
i. Set the AFGen2 To field to Audio Out.
2. For the frequency (the harmonic) and level settings of Audio
Frequency Generator 2 shown in the Performance Test Record,
measure the distortion and SINAD on the Test Set and compare the
measured values to the limits.
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AF Analyzer DC Level Accuracy Performance Test 15
AF Analyzer DC Level Accuracy
Performance Test 15
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-15, “AF
Analyzer DC Level Accuracy Test 15 Record,” on page 265. To measure
DC level accuracy, a DC signal is measured by an external digital multi
meter and compared to the Test Set’s internal DC voltmeter reading.
Figure 8-20
Setup
Multimeter
AUDIO OUT
AUDIO IN HI
INPUT
Procedure
1. Set the multimeter to measure DC volts.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Audio In Lo field to Gnd.
e. Select the RF GENERATOR screen.
f. Set the AFGen1 To field to Audio Out.
g. Set the AFGen1 Freq field to 0.0 Hz.
h. Set the Audio Out field to DC.
i. Set the level of Audio Frequency Generator 1 as shown in the
Performance Test Record and measure the DC level. Compare the
measured voltage to the limits.
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AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-16, “AF
Analyzer Frequency Accuracy to 100 kHz Test 16 Record,” on page 266.
To measure frequency accuracy up to 100 kHz, an AC signal at the
audio input is measured by an external frequency counter and
compared to the Test Set’s internal audio frequency counter.
Figure 8-21
Setup
AUDIO IN HI
Audio Analyzer
OUTPUT
Counter
INPUT
Procedure
1. Set the frequency counter to measure frequency.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 2 field to >99kHz LPF.
e. Set the Audio In Lo field to Gnd.
3. Set the audio analyzer’s source to 1 V and set the frequencies as
shown in the Performance Test Record. Measure the frequency on
the Test Set and compare the measured frequency to the limits.
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AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-17, “AF
Analyzer Frequency Accuracy at 400 kHz Test 17 Record,” on page 267.
To measure frequency accuracy at 400 kHz, the RF signal from the Test
Set’s DUPLEX OUT port is applied to the audio input and the input to
the measuring receiver and the two measured frequencies are
compared.
Figure 8-22
Setup
AUDIO IN HI
Measuring Receiver
INPUT 50Ω
DUPLEX OUT
Procedure
1. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to frequency.
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq to 0.4 MHz.
h. Set the Amplitude to -21 dBm (20 mV).
i. Select the AF ANALYZER screen.
j. Set the AF Anl In field to Audio In.
k. Set the Filter 2 field to >99kHz LPF.
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AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17
l. Set the Audio In Lo field to Gnd.
3. Measure the audio frequency on the measuring receiver and the Test
Set and note the frequency difference. Compare the calculated
difference to the limits shown in the Performance Test Record.
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Oscilloscope Amplitude Accuracy Performance Test 18
Oscilloscope Amplitude Accuracy
Performance Test 18
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-18,
“Oscilloscope Amplitude Accuracy Test 18 Record,” on page 268. A 5 V
ac signal from the audio analyzer is measured by both an external multi
meter and by the Test Set’s internal oscilloscope. Since the oscilloscope
reads peak volts, the RMS reading of the multi meter is multiplied by
the square root of two.
Figure 8-23
Setup
AUDIO IN HI
Audio Analyzer
OUTPUT
Multimeter
INPUT
Procedure
1. Set the digital multimeter to measure ac volts.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 2 field to >99kHz LPF.
e. Set the Audio In Lo field to Gnd.
f. Select the SCOPE screen.
g. Set the Controls field to Marker and move the cursor to the
Marker To Peak+ field.
3. Set the audio analyzer’s source to 1 kHz and 5 V and fine adjust the
level until the voltmeter reads 5 V.
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Oscilloscope Amplitude Accuracy Performance Test 18
4. Set the frequency as shown in the Performance Test Record (PTR).
For each setting, perform the following:
a. Adjust the level until the digital multimeter reads 5 V.
b. Set Controls to Main and adjust the Time/Div on the Test Set to
display 2 to 3 cycles of the waveform.
c. Set Controls to Marker and press the knob (with the cursor in the
Marker To Peak+ field) to move the marker to the peak of the
waveform.
d. Read the Lvl and compare the reading to the limits in the PTR.
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RF Analyzer Level Accuracy Performance Test 19
RF Analyzer Level Accuracy
Performance Test 19
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-19, “RF
Analyzer Level Accuracy Test 19 Record,” on page 269. Level accuracy
is measured using a system power calibration program that resides on a
memory card.
Figure 8-24
Setup
RF IN/OUT
Signal Generator
Sensor Module
Measuring Receiver
SENSOR
INPUT 50Ω
Procedure
1. Obtain the memory card containing the System Power Calibration
program. (To order see “Ordering Parts” on page 46).
2. Run the System Power Calibration as follows:
a. Insert the memory card into the memory card slot.
b. Select the SOFTWARE MENU screen.
c. Set the Select Procedure Location: field to Card.
d. Set the Select Procedure Filename field to SYSPWR0.
e. Press the Run Test key.
3. Follow the instructions as they are presented. As the power
difference is displayed, write these numbers in the Performance Test
Record and compare them with the limits. (If two passes are chosen,
average the two sets of data.) After the acquisition of levels is
complete, select No when asked if you want the calibration factors
downloaded into the Test Set’s memory.
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Chapter 8
Performance Tests
RF Analyzer FM Accuracy Performance Test 20
RF Analyzer FM Accuracy
Performance Test 20
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-20, “RF
Analyzer FM Accuracy Test 20 Record,” on page 271. The AM/FM test
source provides the RF signal with FM. The signal is measured both by
the Test Set’s internal RF analyzer and the measuring receiver. The FM
signal comes from the external audio source in the audio analyzer. The
audio level is varied until the modulation is at the desired FM deviation
as measured by the measuring receiver.
NOTE
Use the AM/FM test source output labeled FM÷32 for 12.5 MHz and the
output labeled FM for 400 MHz. You can measure the frequency with
the measuring receiver and adjust it with the carrier frequency tune
knob, but the exact frequency is not critical.
Figure 8-25
Setup
Audio Analyzer
OUTPUT
AM/FM Test Source
ANT IN
AUDIO
INPUT
FM÷32 or FM OUTPUT
Measuring Receiver
INPUT 50Ω
Procedure
1. On the AM/FM test source, set the test mode to FM.
2. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. Set the detector to RMS.
Chapter 8
211
Performance Tests
RF Analyzer FM Accuracy Performance Test 20
3. On the audio analyzer:
a. Reset the instrument.
b. Set the output frequency to 50 Hz.
4. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF ANALYZER screen.
g. Set the Tune Freq to 12.5 MHz.
h. Set the Input Port field to Ant.
i. Set the IF Filter field to 230 kHz.
j. Select the AF ANALYZER screen.
k. Set the AF Anl In field to FM Demod.
l. Set the Filter 2 field to >99kHz LP.
m. Set the Detector field to RMS.
5. For each RF output from the AM/FM test source (12.5 MHz and 400
MHz corresponding to the FM÷32 and FM outputs) shown in the
Performance Test Record (PTR), do the following:
a. Set the audio analyzer’s frequency (rate) as shown in the PTR.
b. Adjust the audio analyzer’s level until the measuring receiver
reads the FM deviation shown in the PTR.
c. Read the FM deviation on the Test Set and compare the results to
the limits shown in the PTR.
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Chapter 8
Performance Tests
RF Analyzer FM Distortion Performance Test 21
RF Analyzer FM Distortion
Performance Test 21
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-21, “RF
Analyzer FM Distortion Test 21 Record,” on page 272. An audio signal
from the audio analyzer provides FM for the AM/FM test source. The
AM/FM test source provides an RF signal (with FM) to the Test Set’s
internal RF analyzer. The measuring receiver is used to monitor FM
deviation as the level of the audio signal from the audio analyzer is
varied. The audio analyzer then measures distortion introduced by the
Test Set.
Figure 8-26
Setup
Audio Analyzer
INPUT
OUTPUT
AUDIO
MONITOR
OUT
AM/FM Test Source
AUDIO
INPUT
ANT IN
FM OUTPUT
Measuring Receiver
INPUT 50Ω
Procedure
1. On the AM/FM test source, set the test mode to FM.
2. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. Set the high-pass filter to 300 Hz.
d. Set the low-pass filter to 3 kHz.
3. On the audio analyzer:
a. Reset the instrument.
Chapter 8
213
Performance Tests
RF Analyzer FM Distortion Performance Test 21
b. Set the output frequency to 1 kHz.
c. Set the measurement mode to distortion.
4. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF ANALYZER screen.
g. Set the Tune Freq to 400 MHz.
h. Set the Input Port field to Ant.
i. Set the IF Filter field to 230 kHz.
j. Select the AF ANALYZER screen.
k. Set the AF Anl In field to FM Demod.
l. Set the Filter 1 field to 300Hz HPF.
m. Set the Filter 2 field to 3kHz LPF.
n. Set the Detector field to Pk+.
5. For each FM deviation setting shown in the Performance Test Record
(PTR) do the following:
a. Adjust the audio analyzer’s level until the measuring receiver
reads the FM deviation shown in the PTR.
b. Read the distortion on the audio analyzer and compare the
results to the limits shown in the PTR.
214
Chapter 8
Performance Tests
RF Analyzer FM Bandwidth Performance Test 22
RF Analyzer FM Bandwidth
Performance Test 22
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-22, “RF
Analyzer FM Bandwidth Test 22 Record,” on page 273. An audio signal
from the audio analyzer provides FM for the AM/FM test source. The
AM/FM test source provides an RF signal (with FM) to the Test Set’s
internal RF analyzer. The measuring receiver is used to monitor FM
deviation as the level of the audio signal from the audio analyzer is
varied. The audio rate is varied in several steps from 20 Hz to 70 kHz.
The difference between the maximum and minimum FM peak deviation
is noted.
Figure 8-27
Setup
Audio Analyzer
OUTPUT
AM/FM Test Source
ANT IN
AUDIO
INPUT
FM OUTPUT
Measuring Receiver
INPUT 50Ω
Procedure
1. On the AM/FM test source, set the test mode to FM.
2. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. Set the all filters off.
3. On the audio analyzer:
a. Reset the instrument.
Chapter 8
215
Performance Tests
RF Analyzer FM Bandwidth Performance Test 22
b. Set the output frequency to 1 kHz.
4. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF ANALYZER screen.
g. Set the Tune Freq to 400 MHz.
h. Set the Input Port field to Ant.
i. Set the IF Filter field to 230 kHz.
j. Set the Squelch field to Open.
k. Select the AF ANALYZER screen.
l. Set the AF Anl In field to FM Demod.
m. Set the Filter 2 field to >99kHz LP.
n. Set the Detector field to Pk+.
5. Set the audio analyzer to the following frequencies: 20 Hz, 100 Hz, 1
kHz, 10 kHz, 35 kHz, and 70 kHz. For each frequency adjust the
audio analyzer’s level until the measuring receiver reads 25 kHz FM
deviation and record the deviation read on the Test Set.
6. Of the FM deviations measured by the Test Set find the maximum
and minimum deviations and make the following calculation:
Equation 8-2
Maximum Deviation
dB = 20 • log  --------------------------------------------------
 Minimum Deviation 
Record the dB difference in the Performance Test Record and
compare it with the limits shown.
216
Chapter 8
Performance Tests
RF Analyzer Residual FM Performance Test 23
RF Analyzer Residual FM
Performance Test 23
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-23, “RF
Analyzer Residual FM Test 23 Record,” on page 274. The AM/FM test
source provides a CW signal with minimal residual FM. The FM is
measured by the Test Set’s internal RF analyzer.
Figure 8-28
Setup
AM/FM Test Source
ANT IN
LOW RESIDUAL OUTPUT
Procedure
1. On the AM/FM test source, set the test mode to residual FM.
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the RF ANALYZER screen.
g. Set the Tune Freq to 560 MHz.
h. Set the Input Port field to Ant.
i. Set the IF Filter field to 230 kHz.
j. Select the AF ANALYZER screen.
k. Set the AF Anl In field to FM Demod.
l. Set the Filter 1 field to 300Hz HPF.
m. Set the Filter 2 field to 3kHz LPF.
n. Set the Detector field to RMS.
Chapter 8
217
Performance Tests
RF Analyzer Residual FM Performance Test 23
3. Read the FM deviation (residual FM) and record the deviation read
on the Test Set in the Performance Test Record and compare it to the
limits.
218
Chapter 8
Performance Tests
Spectrum Analyzer Image Rejection Performance Test 24
Spectrum Analyzer Image Rejection
Performance Test 24
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-24,
“Spectrum Analyzer Image Rejection (Image) Test 24 Record,” on page
275. This test has two procedures. The first procedure measures the
spectrum analyzer’s ability to reject image frequencies. The spectrum
analyzer is tuned to a signal frequency while an image signal from the
signal generator is applied to the antenna input port.
The second procedure measures the spectrum analyzer’s residual
response at several frequencies.
Setup
Figure 8-29
Spectrum Analyzer Image Rejection Test 24
ANT IN
REF IN
10 MHz OUTPUT
OUTPUT
Signal Generator
Procedure 1
1. On the signal generator:
a. Set the level to -20 dBm.
b. Set the frequency to 613.6 MHz.
c. Set modulation off.
2. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
Chapter 8
219
Performance Tests
Spectrum Analyzer Image Rejection Performance Test 24
d. Select the CDMA GENERATOR screen.
e. Set the CW RF Path field to Bypass.
f. Select the SPEC ANL screen.
g. Set the RF In/Ant field to Ant.
h. Set the Ref Level field to -25 dBm.
i. Set the Span field to 5 kHz.
j. Set the Controls field to Marker.
k. Set the Marker To field to Center Freq.
l. Set the Controls field back to Main.
3. Set the signal generator’s frequency and the Test Set’s spectrum
analyzer center frequency as shown in the Performance Test Record
(PTR) and read the image response on the spectrum analyzer. The
image response is the spectrum analyzer’s marker level (in dBm)
minus the signal generator’s output level (minus −20 dBm). (In other
words, add 20 dB to the marker level.) Compare the results to the
limits.
Procedure 2
1. Disconnect the signal generator from the Test Set.
2. On the Test Set:
a. Set the Controls field to Auxiliary.
b. Set the Input Atten field to Hold at 0 dB.
c. Set the Controls field back to Marker.
d. Set the Marker To field to Center Freq.
e. Set the Controls field to Main.
f. Set the Span field to 10 MHz.
g. Set the Ref Level field to -20 dBm.
3. Set the Test Set’s Center Freq field to the frequencies shown in the
PTR and measure the residual response on the spectrum analyzer’s
marker field and compare it to the limits.
220
Chapter 8
Performance Tests
CDMA Generator Amplitude Level Accuracy Performance Test 25
CDMA Generator Amplitude Level Accuracy
Performance Test 25
The amplitude level accuracy of the CDMA generator is measured
directly with a power meter. These measurements are made at the top
and bottom of the CDMA generator’s vernier range.
Setup 1
Figure 8-30
Setup 1 for Measurements to 1 GHz
Measuring Receiver
SENSOR
INPUT 50Ω
DUPLEX OUT
Sensor Module
Procedure 1
The following procedure applies to Setup 1 (shown in Figure 8-30 on
page 221).
1. Before connecting the equipment, on the measuring receiver:
a. Reset the instrument.
b. Zero and calibrate the sensor module.
NOTE
Make sure the sensor module’s calibration data is entered into the
measuring receiver.
2. Connect the equipment as shown in Setup 1.
3. On the measuring receiver:
a. Set the measurement mode to RF Power.
b. Set the display to log.
Chapter 8
221
Performance Tests
CDMA Generator Amplitude Level Accuracy Performance Test 25
4. On the Test Set:
a. Press Preset.
b. Select the CDMA GENERATOR screen.
c. Set the RF Gen Freq field to 836.52 MHz.
d. Set the CW RF Path field to I/Q.
e. Set the Amplitude to -10 dBm.
5. Set the Test Set to the frequencies and levels listed in the PTR and
record the values.
222
Chapter 8
Performance Tests
CDMA Generator Modulation Accuracy Performance Test 26
CDMA Generator Modulation Accuracy
Performance Test 26
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-26,
“CDMA Generator RF In/Out Test,” on page 277. The modulation
accuracy of the CDMA generator is directly measured with a vector
signal analyzer at the DUPLEX OUT port. Because the vector signal
analyzer cannot measure rho directly, the modulation accuracy is
measured in EVM (Error Vector Magnitude) % rms and rho is
calculated from the EVM data.
Setup
Figure 8-31
CDMA Generator Modulation Accuracy Test 26
Vector Signal Analyzer
DUPLEX OUT
INPUT
Procedure
1. On the Test Set:
a. Press Preset.
b. Press CDMA GEN key
c. Set RF Gen Freq to 836.52 MHz.
d. Set CW RF path to IQ.
e. Set Output Port to Dupl.
f. Set Amplitude to −10 dBM.
g. Set Gen Dir to Rev.
Chapter 8
223
Performance Tests
CDMA Generator Modulation Accuracy Performance Test 26
2. On the Vector Signal Analyzer:
a. Press the Frequency key.
b. Set center frequency to 836.52 MHz.
c. Set the span to 2.6 MHz.
d. Press the Instrument Mode key
e. Press the Digital Demodulation (F4) key
f. Press the Demodulation Setup (F5) key
g. Press the Demodulation Format (F1) key
h. Press the Standard Setups (F7) key.
i. Press the CDMA Mobile (F7) key.
j. Press the D key.
3. Use the following equation to calculate rho.
1
ρ = ------------------------2
1 + EVM
ρ = rho
EVM = Error Vector Magnitude (% rms)
4. Compare and record the rho calculated in Table 9-27, “CDMA
Generator Modulation Accuracy Test 26 Record,” on page 278.
5. Set the CDMA GEN frequency on the Test Set and change the center
frequency on the Vector Signal Analyzer to the 1851.25 MHz.
6. Calculate rho (using the above equation), and record the result (rho)
in Table 9-27, “CDMA Generator Modulation Accuracy Test 26
Record,” on page 278.
224
Chapter 8
Performance Tests
CDMA Analyzer Average Power Level Accuracy Performance Test 27
CDMA Analyzer Average Power Level Accuracy
Performance Test 27
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-27,
“CDMA Generator Modulation Accuracy Test 26 Record,” on page 278.
The CDMA average-power-level accuracy is verified by comparing the
measured power in a CW signal with the power level measured by a
power meter.
Setup
Figure 8-32
CDMA Analyzer Average Power Level Accuracy Test 27
Signal Generator
Amplifier 2
RF IN/OUT
Power Splitter
OUTPUT
Sensor Module
Measuring Receiver
SENSOR
INPUT 50Ω
Procedure
1. On the measuring receiver:
a. Set the measurement mode to RF Power.
b. Calibrate the power sensor.
2. On the signal generator:
a. Set the frequency to 881.32 MHz.
b. Set the amplitude so the measuring receiver reads 4 mW.
Chapter 8
225
Performance Tests
CDMA Analyzer Average Power Level Accuracy Performance Test 27
3. On the Test Set:
a. Press Preset
b. Set the Avg Pwr Units to Watts.
c. Set Tune Freq to 881.32 MHz.
4. Record the Avg Pwr reading in the PTR (see Table 9-28, “CDMA
Analyzer Average Power Level Accuracy Test 27 Record,” on page
279.
5. Repeat steps 2 and 3 for each of the frequencies and levels listed in
the PTR.
226
Chapter 8
Performance Tests
CDMA Analyzer Channel Power Level Accuracy Performance Test 28
CDMA Analyzer Channel Power Level Accuracy
Performance Test 28
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-28,
“CDMA Analyzer Average Power Level Accuracy Test 27 Record,” on
page 279. The tuned channel power level accuracy is verified by
comparing the measured power in a CW signal with the power level
measured by a measuring receiver.
Setup
Figure 8-33
CDMA Analyzer Channel Power Level Accuracy Test 28
Signal Generator
Amplifier 2
RF IN/OUT
Power Splitter
OUTPUT
Sensor Module
Measuring Receiver
SENSOR
INPUT 50Ω
Procedure
1. On the measuring receiver
a. Set the display mode to LOG.
b. Set the measurement mode to RF Level.
c. Calibrate the power sensor.
Chapter 8
227
Performance Tests
CDMA Analyzer Channel Power Level Accuracy Performance Test 28
2. On the signal generator:
a. Set the frequency to 881.32 MHz.
b. Set the output level so the measuring receiver reads 11 dBm
3. Push Preset on the Test Set.
4. On the Test Set:
a. Change the Avg Pwr field to Chan Pwr.
b. Set the Tune Freq to 881.32 MHz
c. Select Calibrate under Chn Pwr Cal.
5. Record the Chan Pwr measurement in the PTR, see Table 9-29,
“CDMA Analyzer Channel Power Level Accuracy Test 28 Record,” on
page 280.
6. Repeat steps 2 and 3 for each of the data points listed in the PTR.
NOTE
The Chan Pwr Cal is only required when the frequency is changed.
228
Chapter 8
Performance Tests
CDMA Analyzer Modulation Accuracy Performance Test 29
CDMA Analyzer Modulation Accuracy
Performance Test 29
The purpose of this test is to verify that the Test Set meets the
specification limits in PTR (Performance Test Record) Table 9-29,
“CDMA Analyzer Channel Power Level Accuracy Test 28 Record,” on
page 280. This test verifies the performance of the Test Set’s CDMA
analyzer. The CDMA analyzer is performing properly if the rho values
calculated as the results of the following procedure fall within the lower
and upper limits specified in Table 9-29 on page 280.
To determine rho, the signal from the Test Set’s CDMA generator is
compared with a known-calibrated vector signal analyzer. This is done
by setting the Test Set’s CDMA generator in forward channel (QPSK)
mode and then measuring modulation accuracy with the vector signal
analyzer. Since the vector signal analyzer cannot measure rho directly,
the EVM (Error Vector Magnitude) % rms is measured and rho is
calculated from the EVM data.
Setup
Figure 8-34
CDMA Analyzer Modulation Accuracy Test 29
Vector Signal Analyzer
DUPLEX OUT
RF IN/OUT
INPUT
Procedure
1. On the Test Set:
a. Press the Preset key.
b. Press the CDMA Gen key. The CDMA GENERATOR screen
appears, see Figure 8-35.
c. Set the RF Gen Freq to 881.52 MHz.
Chapter 8
229
Performance Tests
CDMA Analyzer Modulation Accuracy Performance Test 29
d. Ensure the CW RF path is set to IQ.
e. Ensure the Output Port is set to Dupl.
f. Set the Amplitude to −10 dBm.
Figure 8-35 CDMA GENERATOR Screen
CDMA GENERATOR
Avg Pwr
ADC FS
dBm
dB
13.91
RF Gen Freq
881.520000
Amplitude
-10.0
MHz
Gen Dir
Fwd/Rev
EQ In/Out
dBm
Gen Special
Normal
CW RF Path
Bypass/IQ
PN Offset
0.00
Output Port
RF Out/Dupl
Even Sec In
Enable/Not
Data Source
ZeroesIn
Audio
Gen Mode
Data
Data Rate
9.6 Kbps
cdmagen1.eps
g. Set Gen Dir to FWD and EQ In , see Figure 8-35.
h. Press the CDMA Anl key. The CDMA ANALYZER screen appears,
see Figure 8-36 on page 230.
i. Set the Tune Freq to 881.52 MHz.
j. Change measurement field from Avg Pwr to Rho see Figure 8-36
on page 230.
Figure 8-36 CDMA ANALYZER Screen
CDMA ANALYZER
Avg Pwr
Choices
Chan Pwr
Rho
EVM
Avg Pwr
Tune Freq
881.520000
dBm
ADC FS
13.91
Pwr Zero
Zero
Pwr Intvl
5.00
Auto Zero
Auto/Manual
Pwr Gain
Auto/Hold
ms
MHz
66 dB
Input Port
RF In ONLY
dB
Even Sec In
Enable/Not
Anl Special
Normal
Analyzer
Arm Meas
Audio
In
Single/Cont
Disarm
Qual Event
80 ms
Trig Event
Immed
cdmaana2.eps
230
Chapter 8
Performance Tests
CDMA Analyzer Modulation Accuracy Performance Test 29
2. On the vector signal analyzer:
a. Set the center frequency to 881.52 MHz.
b. Set the span to 2.6 MHz.
c. Press the Instrument Mode key.
d. Press the Digital Demodulation (F4) key.
e. Press the Demodulation Setup (F5) key.
f. Press the Demodulation Format (F1) key.
g. Press the Standard Setups (F7) key.
h. Press the CDMA Base (F6) key.
i. Press the D display button.
3. Use the following formula to calculate rho.
1
ρ = ------------------------2
1 + EVM
ρ = rho
EVM = Error Vector Magnitude (%rms)
4. Compare and record the result in PTR Table 9-29, “CDMA Analyzer
Channel Power Level Accuracy Test 28 Record,” on page 280.
5. Repeat the previous steps for a frequency of 1851.25 MHz and record
the results in PTR Table 9-29, “CDMA Analyzer Channel Power
Level Accuracy Test 28 Record,” on page 280.
Chapter 8
231
Performance Tests
CDMA Analyzer Modulation Accuracy Performance Test 29
232
Chapter 8
9
Performance Test Records
Use this chapter to record the results of the performance tests in
Chapter 8 , “Performance Tests,” on page 173.
233
Performance Test Records
RF Generator FM Distortion Performance Test 1 Record
RF Generator FM Distortion
Performance Test 1 Record
For test procedure, see “RF Generator FM Distortion Performance Test
1” on page 178.
Table 9-1
RF Generator FM Distortion Test 1 Record
Level
(dBm)
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
FM Distortion Limits
(%)
Upper
−10
10
99
1
0.50
−10
10
5
1
0.50
−10
312.5
5
1
0.50
−10
425
50
1
0.50
−10
501
99
1
0.50
−10
501
50
1
0.50
−10
501
5
1
0.50
−10
568.75
50
1
0.50
−10
656.25
99
1
0.50
−10
656.25
50
1
0.50
−10
656.25
5
1
0.50
−10
750
99
1
0.50
−10
750
50
1
0.50
−10
750
5
1
0.50
−10
856.25
99
1
0.50
−10
856.25
50
1
0.50
−10
856.25
5
1
0.50
−10
956.25
50
1
0.50
−10
976.002
5
1
0.50
−10
1000
99
1
0.50
−10
1000
50
1
0.50
−10
1000
11
1
0.50
−10
1000
5
1
0.50
234
Actual
Chapter 9
Performance Test Records
RF Generator FM Distortion Performance Test 1 Record
Table 9-1
RF Generator FM Distortion Test 1 Record
Level
(dBm)
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
FM Distortion Limits
(%)
Upper
−10
1000
6
1
0.50
−10
1000
7
1
0.50
−10
1000
8
1
0.50
−10
1000
9
1
0.50
−10
998.401
8
1
0.50
−10
768.001
8
1
0.50
−0
512.001
8
1
0.50
−10
511.601
8
1
0.50
−10
511.201
8
1
0.50
Actual
The following entries are for the 2 GHz setup.
−10
1700
99
1
1.00
−10
1700
50
1
1.00
−10
1700
5
1
1.00
−10
2000
99
1
1.00
−10
2000
50
1
1.00
−10
2000
5
1
1.00
Chapter 9
235
Performance Test Records
RF Generator FM Accuracy Performance Test 2 Record
RF Generator FM Accuracy
Performance Test 2 Record
For test procedure, see “RF Generator FM Accuracy Performance Test
2” on page 181.
Table 9-2
Level
(dBm)
RF Generator FM Accuracy Test 2 Record
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
FM Deviation Limits (kHz)
Lower
Upper
−10
10
99
1
95.035
102.965
−10
10
3
1
2.845
3.155
−10
312.5
3
1
2.845
3.155
−10
425
50
1
47.750
52.25
−10
501
99
1
95.035
102.965
−10
501
50
1
47.750
52.25
−10
501
3
1
2.845
3.155
−10
568.75
50
1
47.750
52.25
−10
656.25
99
1
95.035
102.965
−10
656.25
50
1
47.750
52.25
−10
656.25
3
1
2.845
3.155
−10
750
99
1
95.035
102.965
−10
750
50
1
47.750
52.25
−10
750
3
1
2.845
3.155
−10
856.25
99
1
95.035
102.965
−10
856.25
50
1
47.750
52.25
−10
856.25
3
1
2.845
3.155
−10
956.25
50
1
47.750
52.25
−10
976.002
3
1
2.845
3.155
−10
1000
99
1
95.035
102.965
−10
1000
50
1
47.750
52.25
−10
1000
11
1
10.115
11.885
236
Actual
Chapter 9
Performance Test Records
RF Generator FM Accuracy Performance Test 2 Record
Table 9-2
Level
(dBm)
RF Generator FM Accuracy Test 2 Record
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
FM Deviation Limits (kHz)
Lower
-10
1000
3
1
Upper
2.845
3.155
Actual
The following entries are for the 2 GHz setup.
−10
1700
99
1
95.035
102.965
−10
1700
50
1
47.750
52.25
−10
1700
3
1
2.845
3.155
−10
2000
99
1
95.035
102.965
−10
2000
50
1
47.750
52.25
−10
2000
3
1
2.845
3.155
Chapter 9
237
Performance Test Records
RF Generator FM Flatness Performance Test 3 Record
RF Generator FM Flatness
Performance Test 3 Record
For test procedure, see “RF Generator FM Flatness Performance Test 3”
on page 184.
Table 9-3
Level
(dBm)
RF Generator FM Flatness Test 3 Record
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
Computed FM
Flatness Limits
(dB)
Measured
Reading
(kHz)
Computed
Results
(dB)
Lower
Reading
Computed
Upper
−10
521
50
1
−10
521
50
0.1
−1
1
−10
521
50
0.2
−1
1
−10
521
50
2
−1
1
−10
521
50
10
−1
1
−10
521
50
25
−1
1
−10
975.5
50
−10
975.5
50
0.1
−1
1
−10
975.5
50
0.2
−1
1
−10
975.5
50
2
−1
1
−10
975.5
50
10
−1
1
−10
975.5
50
25
−1
1
Reference
0 dB
Reference
0 dB
The following entries are for the 2 GHz setup.
−10
1700
50
−10
1700
50
0.1
−1
1
−10
1700
50
0.2
−1
1
−10
1700
50
2
−1
1
−10
1700
50
10
−1
1
−10
1700
50
25
−1
1
−10
2000
50
−10
2000
50
238
Reference
0 dB
Reference
0.1
−1
0 dB
1
Chapter 9
Performance Test Records
RF Generator FM Flatness Performance Test 3 Record
Table 9-3
Level
(dBm)
RF Generator FM Flatness Test 3 Record
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
Computed FM
Flatness Limits
(dB)
Measured
Reading
(kHz)
Computed
Results
(dB)
Lower
Upper
Reading
Computed
−10
2000
50
0.2
−1
1
−10
2000
50
2
−1
1
−10
2000
50
10
−1
1
−10
2000
50
25
−1
1
Chapter 9
239
Performance Test Records
RF Generator Residual FM Performance Test 4 Record
RF Generator Residual FM
Performance Test 4 Record
For test procedure, see “RF Generator Residual FM Performance Test 4”
on page 187.
Table 9-4
LO
(MHz)
RF Generator Residual FM Test 4 Record
RF
(MHz)
Residual FM Limits (Hz)
Upper
11.5
10
7
101.5
100
7
249.5
248
7
251.5
250
4
401.5
400
4
501.5
500
4
502.5
501
7
512.701
511.201
7
513.101
511.601
7
513.501
512.001
7
626.5
625
7
736.5
735
7
741.5
740
7
746.5
745
7
751.5
750
7
769.501
768.001
7
846.5
845
7
851.5
850
7
856.5
855
7
866.5
865
7
901.5
900
7
999.901
998.401
7
240
Actual
Chapter 9
Performance Test Records
RF Generator Residual FM Performance Test 4 Record
Table 9-4
LO
(MHz)
RF Generator Residual FM Test 4 Record
RF
(MHz)
Residual FM Limits (Hz)
Upper
1001.5
1000
Actual
7
The following entries are for the 2 GHz setup.
201.5
1700
14
501.5
2000
14
Chapter 9
241
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
RF Generator Level Accuracy
Performance Test 5 Record
For test procedure, see “RF Generator Level Accuracy Performance Test
5” on page 190.
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
Actual
The following entries are for Procedure 1.
DUPLEX OUT
3
−10
−11.500
−8.500
DUPLEX OUT
3
−15
−16.500
−13.500
DUPLEX OUT
3
−20
−21.500
−18.500
DUPLEX OUT
3
−25
−26.500
−23.500
DUPLEX OUT
3
−30
−31.500
−28.500
DUPLEX OUT
3
−35
−36.500
−33.500
DUPLEX OUT
3
−40
−41.500
−38.500
DUPLEX OUT
3
−45
−46.500
−43.500
DUPLEX OUT
3
−50
−51.500
−48.500
DUPLEX OUT
3
−55
−56.500
−53.500
DUPLEX OUT
3
−60
−61.500
−58.500
DUPLEX OUT
3
−65
−66.500
−63.500
DUPLEX OUT
3
−70
−71.500
−68.500
DUPLEX OUT
3
−75
−76.500
−73.500
DUPLEX OUT
3
−80
−81.500
−78.500
DUPLEX OUT
3
−85
−86.500
−83.500
DUPLEX OUT
3
−90
−91.500
−88.500
DUPLEX OUT
3
−95
−96.500
−93.500
DUPLEX OUT
3
−100
−101.500
−98.500
DUPLEX OUT
3
−105
−106.500
−103.500
DUPLEX OUT
3
−110
−111.500
−108.500
DUPLEX OUT
3
−115
−116.500
−113.500
242
Chapter 9
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
DUPLEX OUT
3
−120
−121.500
−118.500
DUPLEX OUT
3
−125
−126.500
−123.500
RF IN/OUT
3
−40
−41.000
−39.000
RF IN/OUT
3
−45
−46.000
−44.000
RF IN/OUT
3
−50
−51.000
−49.000
RF IN/OUT
3
−55
−56.000
−54.000
RF IN/OUT
3
−60
−61.000
−59.000
RF IN/OUT
3
−65
−66.000
−64.000
RF IN/OUT
3
−70
−71.000
−69.000
RF IN/OUT
3
−75
−76.000
−74.000
RF IN/OUT
3
−80
−81.000
−79.000
RF IN/OUT
3
−85
−86.000
−84.000
RF IN/OUT
3
−90
−91.000
−89.000
RF IN/OUT
3
−95
−96.000
−94.000
RF IN/OUT
3
−100
−101.000
−99.000
RF IN/OUT
3
−105
−106.000
−104.000
RF IN/OUT
3
−110
−111.000
−109.000
RF IN/OUT
3
−115
−116.000
−114.000
RF IN/OUT
3
−120
−121.000
−119.000
RF IN/OUT
3
−125
−126.000
−124.000
DUPLEX OUT
687.5
−10
−11.500
−8.500
DUPLEX OUT
687.5
−15
−16.500
−13.500
DUPLEX OUT
687.5
−20
−21.500
−18.500
DUPLEX OUT
687.5
−25
−26.500
−23.500
DUPLEX OUT
687.5
−30
−31.500
−28.500
DUPLEX OUT
687.5
−35
−36.500
−33.500
DUPLEX OUT
687.5
−40
−41.500
−38.500
DUPLEX OUT
687.5
−45
−46.500
−43.500
Chapter 9
Actual
243
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
DUPLEX OUT
687.5
−50
−51.500
−48.500
DUPLEX OUT
687.5
−55
−56.500
−53.500
DUPLEX OUT
687.5
−60
−61.500
−58.500
DUPLEX OUT
687.5
−65
−66.500
−63.500
DUPLEX OUT
687.5
−70
−71.500
−68.500
DUPLEX OUT
687.5
−75
−76.500
−73.500
DUPLEX OUT
687.5
−80
−81.500
−78.500
DUPLEX OUT
687.5
−85
−86.500
−83.500
DUPLEX OUT
687.5
−90
−91.500
−88.500
DUPLEX OUT
687.5
−95
−96.500
−93.500
DUPLEX OUT
687.5
−100
−101.500
−98.500
DUPLEX OUT
687.5
−105
−106.500
−103.500
DUPLEX OUT
687.5
−110
−111.500
−108.500
DUPLEX OUT
687.5
−115
−116.500
−113.500
DUPLEX OUT
687.5
−120
−121.500
−118.500
DUPLEX OUT
687.5
−125
−126.500
−123.500
RF IN/OUT
687.5
−40
−41.000
−39.000
RF IN/OUT
687.5
−45
−46.000
−44.000
RF IN/OUT
687.5
−50
−51.000
−49.000
RF IN/OUT
687.5
−55
−56.000
−54.000
RF IN/OUT
687.5
−60
−61.000
−59.000
RF IN/OUT
687.5
−65
−66.000
−64.000
RF IN/OUT
687.5
−70
−71.000
−69.000
RF IN/OUT
687.5
−75
−76.000
−74.000
RF IN/OUT
687.5
−80
−81.000
−79.000
RF IN/OUT
687.5
−85
−86.000
−84.000
RF IN/OUT
687.5
−90
−91.000
−89.000
RF IN/OUT
687.5
−95
−96.000
−94.000
244
Actual
Chapter 9
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
RF IN/OUT
687.5
−100
−101.000
−99.000
RF IN/OUT
687.5
−105
−106.000
−104.000
RF IN/OUT
687.5
−110
−111.000
−109.000
RF IN/OUT
687.5
−115
−116.000
−114.000
RF IN/OUT
687.5
−120
−121.000
−119.000
RF IN/OUT
687.5
−125
−126.000
−124.000
DUPLEX OUT
1000
−10
−11.500
−8.500
DUPLEX OUT
1000
−15
−16.500
−13.500
DUPLEX OUT
1000
−20
−21.500
−18.500
DUPLEX OUT
1000
−25
−26.500
−23.500
DUPLEX OUT
1000
−30
−31.500
−28.500
DUPLEX OUT
1000
−35
−36.500
−33.500
DUPLEX OUT
1000
−40
−41.500
−38.500
DUPLEX OUT
1000
−45
−46.500
−43.500
DUPLEX OUT
1000
−50
−51.500
−48.500
DUPLEX OUT
1000
−55
−56.500
−53.500
DUPLEX OUT
1000
−60
−61.500
−58.500
DUPLEX OUT
1000
−65
−66.500
−63.500
DUPLEX OUT
1000
−70
−71.500
−68.500
DUPLEX OUT
1000
−75
−76.500
−73.500
DUPLEX OUT
1000
−80
−81.500
−78.500
DUPLEX OUT
1000
−85
−86.500
−83.500
DUPLEX OUT
1000
−90
−91.500
−88.500
DUPLEX OUT
1000
−95
−96.500
−93.500
DUPLEX OUT
1000
−100
−101.500
−98.500
DUPLEX OUT
1000
−105
−106.500
−103.500
DUPLEX OUT
1000
−110
−111.500
−108.500
DUPLEX OUT
1000
−115
−116.500
−113.500
Chapter 9
Actual
245
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
DUPLEX OUT
1000
−120
−121.500
−118.500
DUPLEX OUT
1000
−125
−126.500
−123.500
RF IN/OUT
1000
−40
−41.000
−39.000
RF IN/OUT
1000
−45
−46.000
−44.000
RF IN/OUT
1000
−50
−51.000
−49.000
RF IN/OUT
1000
−55
−56.000
−54.000
RF IN/OUT
1000
−60
−61.000
−59.000
RF IN/OUT
1000
−65
−66.000
−64.000
RF IN/OUT
1000
−70
−71.000
−69.000
RF IN/OUT
1000
−75
−76.000
−74.000
RF IN/OUT
1000
−80
−81.000
−79.000
RF IN/OUT
1000
−85
−86.000
−84.000
RF IN/OUT
1000
−90
−91.000
−89.000
RF IN/OUT
1000
−95
−96.000
−94.000
RF IN/OUT
1000
−100
−101.000
−99.000
RF IN/OUT
1000
−105
−106.000
−104.000
RF IN/OUT
1000
−110
−111.000
−109.000
RF IN/OUT
1000
−115
−116.000
−114.000
RF IN/OUT
1000
−120
−121.000
−119.000
RF IN/OUT
1000
−125
−126.000
−124.000
Actual
The following entries are for the 2 GHz setup
DUPLEX OUT
1700
−10
−11.500
−8.500
DUPLEX OUT
1700
−15
−16.500
−13.500
DUPLEX OUT
1700
−20
−21.500
−18.500
DUPLEX OUT
1700
−25
−26.500
−23.500
DUPLEX OUT
1700
−30
−31.500
−28.500
DUPLEX OUT
1700
−35
−36.500
−33.500
DUPLEX OUT
1700
−40
−41.500
−38.500
246
Chapter 9
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
DUPLEX OUT
1700
−45
−46.500
−43.500
DUPLEX OUT
1700
−50
−51.500
−48.500
DUPLEX OUT
1700
−55
−56.500
−53.500
DUPLEX OUT
1700
−60
−61.500
−58.500
DUPLEX OUT
1700
−65
−66.500
−63.500
DUPLEX OUT
1700
−70
−71.500
−68.500
DUPLEX OUT
1700
−75
−76.500
−73.500
DUPLEX OUT
1700
−80
−81.500
−78.500
DUPLEX OUT
1700
−85
−86.500
−83.500
DUPLEX OUT
1700
−90
−91.500
−88.500
DUPLEX OUT
1700
−95
−96.500
−93.500
DUPLEX OUT
1700
−100
−101.500
−98.500
DUPLEX OUT
1700
−105
−106.500
−103.500
DUPLEX OUT
1700
−110
−111.500
−108.500
DUPLEX OUT
1700
−115
−116.500
−113.500
DUPLEX OUT
1700
−120
−121.500
−118.500
DUPLEX OUT
1700
−125
−126.500
−123.500
RF IN/OUT
1700
−40
−41.000
−39.000
RF IN/OUT
1700
−45
−46.000
−44.000
RF IN/OUT
1700
−50
−51.000
−49.000
RF IN/OUT
1700
−55
−56.000
−54.000
RF IN/OUT
1700
−60
−61.000
−59.000
RF IN/OUT
1700
−65
−66.000
−64.000
RF IN/OUT
1700
−70
−71.000
−69.000
RF IN/OUT
1700
−75
−76.000
−74.000
RF IN/OUT
1700
−80
−81.000
−79.000
RF IN/OUT
1700
−85
−86.000
−84.000
RF IN/OUT
1700
−90
−91.000
−89.000
Chapter 9
Actual
247
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
RF IN/OUT
1700
−95
−96.000
−94.000
RF IN/OUT
1700
−100
−101.000
−99.000
RF IN/OUT
1700
−105
−106.000
−104.000
RF IN/OUT
1700
−110
−111.000
−109.000
RF IN/OUT
1700
−115
−116.000
−114.000
RF IN/OUT
1700
−120
−121.000
−119.000
RF IN/OUT
1700
−125
−126.000
−124.000
DUPLEX OUT
2000
−10
−11.500
−8.500
DUPLEX OUT
2000
−15
−16.500
−13.500
DUPLEX OUT
2000
−20
−21.500
−18.500
DUPLEX OUT
2000
−25
−26.500
−23.500
DUPLEX OUT
2000
−30
−31.500
−28.500
DUPLEX OUT
2000
−35
−36.500
−33.500
DUPLEX OUT
2000
−40
−41.500
−38.500
DUPLEX OUT
2000
−45
−46.500
−43.500
DUPLEX OUT
2000
−50
−51.500
−48.500
DUPLEX OUT
2000
−55
−56.500
−53.500
DUPLEX OUT
2000
−60
−61.500
−58.500
DUPLEX OUT
2000
−65
−66.500
−63.500
DUPLEX OUT
2000
−70
−71.500
−68.500
DUPLEX OUT
2000
−75
−76.500
−73.500
DUPLEX OUT
2000
−80
−81.500
−78.500
DUPLEX OUT
2000
−85
−86.500
−83.500
DUPLEX OUT
2000
−90
−91.500
−88.500
DUPLEX OUT
2000
−95
−96.500
−93.500
DUPLEX OUT
2000
−100
−101.500
−98.500
DUPLEX OUT
2000
−105
−106.500
−103.500
DUPLEX OUT
2000
−110
−111.500
−108.500
248
Actual
Chapter 9
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Table 9-5
RF Generator Level Accuracy Test 5 Record
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
DUPLEX OUT
2000
−115
−116.500
−113.500
DUPLEX OUT
2000
−120
−121.500
−118.500
DUPLEX OUT
2000
−125
−126.500
−123.500
RF IN/OUT
2000
−40
−41.000
−39.000
RF IN/OUT
2000
−45
−46.000
−44.000
RF IN/OUT
2000
−50
−51.000
−49.000
RF IN/OUT
2000
−55
−56.000
−54.000
RF IN/OUT
2000
−60
−61.000
−59.000
RF IN/OUT
2000
−65
−66.000
−64.000
RF IN/OUT
2000
−70
−71.000
−69.000
RF IN/OUT
2000
−75
−76.000
−74.000
RF IN/OUT
2000
−80
−81.000
−79.000
RF IN/OUT
2000
−85
−86.000
−84.000
RF IN/OUT
2000
−90
−91.000
−89.000
RF IN/OUT
2000
−95
−96.000
−94.000
RF IN/OUT
2000
−100
−101.000
−99.000
RF IN/OUT
2000
−105
−106.000
−104.000
RF IN/OUT
2000
−110
−111.000
−109.000
RF IN/OUT
2000
−115
−116.000
−114.000
RF IN/OUT
2000
−120
−121.000
−119.000
RF IN/OUT
2000
−125
−126.000
−124.000
Chapter 9
Actual
249
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
RF Generator Harmonics Spectral Purity
Performance Test 6 Record
For test procedure, see “RF Generator Harmonics Spectral Purity
Performance Test 6” on page 195.
Table 9-6
Level
(dBm)
RF Generator Harmonics Spectral Purity Test 6
Record
RF Freq
(MHz)
Harmonic
Number
Harmonic Limits (dBc)
Upper
-10
1
2nd
−25.000
-10
1
3rd
−25.000
-10
2
2nd
−25.000
-10
2
3rd
−25.000
-10
5
2nd
−25.000
-10
5
3rd
−25.000
-10
10
2nd
−25.000
-10
10
3rd
−25.000
-10
20
2nd
−25.000
-10
20
3rd
−25.000
-10
50
2nd
−25.000
-10
50
3rd
−25.000
-10
100
2nd
−25.000
-10
100
3rd
−25.000
-10
200
2nd
−25.000
-10
200
3rd
−25.000
-10
300
2nd
−25.000
-10
300
3rd
−25.000
-10
400
2nd
−25.000
-10
400
3rd
−25.000
-10
500
2nd
−25.000
-10
500
3rd
−25.000
-10
600
2nd
−25.000
250
Actual
Chapter 9
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
Table 9-6
Level
(dBm)
RF Generator Harmonics Spectral Purity Test 6
Record
RF Freq
(MHz)
Harmonic
Number
Harmonic Limits (dBc)
Upper
-10
600
3rd
−25.000
-10
700
2nd
−25.000
-10
700
3rd
−25.000
-10
800
2nd
−25.000
-10
800
3rd
−25.000
-10
900
2nd
−25.000
-10
900
3rd
−25.000
-10
1000
2nd
−25.000
-10
1000
3rd
−25.000
-10
1700
2nd
−25.000
-10
1700
3rd
−25.000
-10
1800
2nd
−25.000
-10
1800
3rd
−25.000
-10
1900
2nd
−25.000
-10
1900
3rd
−25.000
-10
2000
2nd
−25.000
-10
2000
3rd
−25.000
-11
1
2nd
−25.000
-11
1
3rd
−25.000
-11
2
2nd
−25.000
-11
2
3rd
−25.000
-11
5
2nd
−25.000
-11
5
3rd
−25.000
-11
10
2nd
−25.000
-11
10
3rd
−25.000
-11
20
2nd
−25.000
-11
20
3rd
−25.000
-11
50
2nd
−25.000
Chapter 9
Actual
251
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
Table 9-6
Level
(dBm)
RF Generator Harmonics Spectral Purity Test 6
Record
RF Freq
(MHz)
Harmonic
Number
Harmonic Limits (dBc)
Upper
-11
50
3rd
−25.000
−11
100
2nd
−25.000
−11
100
3rd
−25.000
−11
200
2nd
−25.000
−11
200
3rd
−25.000
−11
300
2nd
−25.000
−11
300
3rd
−25.000
−11
400
2nd
−25.000
−11
400
3rd
−25.000
−11
500
2nd
−25.000
−11
500
3rd
−25.000
−11
600
2nd
−25.000
−11
600
3rd
−25.000
−11
700
2nd
−25.000
−11
700
3rd
−25.000
−11
800
2nd
−25.000
−11
800
3rd
−25.000
−11
900
2nd
−25.000
−11
900
3rd
−25.000
−11
1000
2nd
−25.000
−11
1000
3rd
−25.000
−12
1700
2nd
−25.000
−12
1700
3rd
−25.000
−12
1800
2nd
−25.000
−12
1800
3rd
−25.000
−12
1900
2nd
−25.000
−12
1900
3rd
−25.000
−12
2000
2nd
−25.000
252
Actual
Chapter 9
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
Table 9-6
Level
(dBm)
RF Generator Harmonics Spectral Purity Test 6
Record
RF Freq
(MHz)
Harmonic
Number
Harmonic Limits (dBc)
Upper
−12
Chapter 9
2000
3rd
Actual
−25.000
253
Performance Test Records
RF Generator Spurious Spectral Purity Performance Test 7 Record
RF Generator Spurious Spectral Purity
Performance Test 7 Record
For test procedure, see “RF Generator Spurious Spectral Purity
Performance Test 7” on page 196.
Table 9-7
Spurious
Source
RF Generator Spurious Spectral Purity Test 7 Record
Level
(dBm)
RF Freq
(MHz)
Spur Freq
(MHz)
Spurious Signal Limits
(dBc)
Upper
3/2 Mixer
−10
242
274
−45.000
3/2 Mixer
−10
247
259
−45.000
Supply
−11
100
100.03
−45.000
Supply
−11
400
400.03
−60.000
Supply
−11
501
501.03
−60.000
Supply
−11
1000
999.97
−60.000
RF Feedthru
−11
1
999
−45.000
LO Feedthru
−11
1
1000
−45.000
RF Feedthru
−11
11
989
−45.000
RF Feedthru
−11
21
979
−45.000
RF Feedthru
−11
41
959
−45.000
RF Feedthru
11
61
939
−45.000
RF Feedthru
−11
81
919
−45.000
RF Feedthru
−11
91
909
−45.000
RF Feedthru
−11
101
899
−45.000
RF Feedthru
−11
111
889
−45.000
RF Feedthru
−11
121
879
−45.000
3/2 Mixer
−11
242
274
−45.000
3/2 Mixer
−11
247
259
−45.000
4/3 Mixer
−11
242
32
−45.000
4/3 Mixer
−11
247
12
−45.000
5/4 Mixer
−11
211
55
−45.000
5/4 Mixer
−11
217
85
−45.000
254
Actual
Chapter 9
Performance Test Records
RF Generator Spurious Spectral Purity Performance Test 7 Record
Table 9-7
Spurious
Source
RF Generator Spurious Spectral Purity Test 7 Record
Level
(dBm)
RF Freq
(MHz)
Spur Freq
(MHz)
Spurious Signal Limits
(dBc)
Upper
5/4 Mixer
−11
221
105
−45.000
5/4 Mixer
−11
227
135
−45.000
5/4 Mixer
−11
231
155
−45.000
5/4 Mixer
−11
237
185
−45.000
Ref 10 MHz
−11
165
175
−45.000
Ref 1 MHz
−11
150
150.2
−45.000
Ref 1 MHz
−11
150
149.8
−45.000
Ref 1 MHz
−11
150
150.4
−45.000
Ref 1 MHz
−11
150
149.6
−45.000
Ref 1 MHz
−11
150
150.6
−45.000
Reference
−11
150
149.4
−45.000
Signal
Feedthru
−10
1700
1000
−55.000
Signal
Feedthru
−10
1700
2000
−55.000
LO Feedthru
−10
1700
2700
−55.000
Signal
Feedthru
−10
1851
800
−55.000
Signal
Feedthru
−10
1851
1600
−55.000
LO Feedthru
−10
1851
1651
−55.000
Chapter 9
Actual
255
Performance Test Records
AF Generator AC Level Accuracy Performance Test 8 Record
AF Generator AC Level Accuracy
Performance Test 8 Record
For test procedure, see “AF Generator AC Level Accuracy Performance
Test 8” on page 197.
Table 9-8
AF Generator AC Level Accuracy Test 8 Record
AF
Generator
Frequency
(Hz)
Level
(mV)
AC Level Limits (mV)
Lower
Upper
1
25000
4000
3885.000
4115.000
1
25000
700
682.500
717.500
1
25000
75
70.000
80.000
1
10000
4000
3885.000
4115.000
1
10000
700
682.500
717.500
1
10000
75
70.000
80.000
1
1000
4000
3885.000
4115.000
1
1000
700
682.500
717.500
1
1000
75
70.000
80.000
1
100
4000
3885.000
4115.000
1
100
700
682.500
717.500
1
100
75
70.000
80.000
2
25000
4000
3885.000
4115.000
2
25000
700
682.500
717.500
2
25000
75
70.000
80.000
2
10000
4000
3885.000
4115.000
2
10000
700
682.500
717.500
2
10000
75
70.000
80.000
2
1000
4000
3885.000
4115.000
2
1000
700
682.500
717.500
2
1000
75
70.000
80.000
2
100
4000
3885.000
4115.000
2
100
700
682.500
717.500
256
Actual
Chapter 9
Performance Test Records
AF Generator AC Level Accuracy Performance Test 8 Record
Table 9-8
AF Generator AC Level Accuracy Test 8 Record
AF
Generator
2
Frequency
(Hz)
100
Chapter 9
Level
(mV)
75
AC Level Limits (mV)
Lower
Upper
70.000
80.000
Actual
257
Performance Test Records
AF Generator DC Level Accuracy Performance Test 9 Record
AF Generator DC Level Accuracy
Performance Test 9 Record
For test procedure, see “AF Generator DC Level Accuracy Performance
Test 9” on page 198.
Table 9-9
AF
Generator
AF Generator DC Level Accuracy Test 9 Record
Level
(mV)
DC Level Limits (mV)
Lower
Upper
1
4000
3820.000
4180.000
1
1000
925.000
1075.000
2
4000
3820.000
4180.000
2
1000
925.000
1075.000
258
Actual
Chapter 9
Performance Test Records
AF Generator Residual Distortion Performance Test 10 Record
AF Generator Residual Distortion
Performance Test 10 Record
For test procedure, see “AF Generator Residual Distortion Performance
Test 10” on page 199.
Table 9-10
AF
Generator
AF Generator Residual Distortion Test 10 Record
Frequency
(Hz)
Level
(mV)
Distortion Limits (%)
Upper
1
25000
4000
0.125
1
25000
2000
0.125
1
25000
200
0.125
1
10000
4000
0.125
1
10000
2000
0.125
1
10000
200
0.125
1
1000
4000
0.125
1
1000
2000
0.125
1
1000
200
0.125
1
100
4000
0.125
1
100
2000
0.125
1
100
200
0.125
2
25000
4000
0.125
2
25000
2000
0.125
2
25000
200
0.125
2
10000
4000
0.125
2
10000
2000
0.125
2
10000
200
0.125
2
1000
4000
0.125
2
1000
2000
0.125
2
1000
200
0.125
2
100
4000
0.125
2
100
2000
0.125
Chapter 9
Actual
259
Performance Test Records
AF Generator Residual Distortion Performance Test 10 Record
Table 9-10
AF
Generator
AF Generator Residual Distortion Test 10 Record
Frequency
(Hz)
Level
(mV)
Distortion Limits (%)
Upper
2
260
100
200
Actual
0.125
Chapter 9
Performance Test Records
AF Generator Frequency Accuracy Performance Test 11 Record
AF Generator Frequency Accuracy
Performance Test 11 Record
For test procedure, see “AF Generator Frequency Accuracy Performance
Test 11” on page 200.
Table 9-11
AF
Generator
AF Generator Frequency Accuracy Test 11 Record
Frequency
(Hz)
Frequency Limits (Hz)
Lower
Upper
1
25000
24993.750
25006.250
1
10000
9997.500
10002.500
1
5000
4998.750
500.125
1
2000
1999.500
2000.500
1
1000
999.750
1000.250
1
500
499.875
500.125
1
200
199.950
200.050
1
100
99.975
100.025
1
50
49.988
50.012
1
20
19.995
20.005
2
25000
24993.750
25006.250
2
10000
9997.500
10002.500
2
5000
4998.750
500.125
2
2000
1999.500
2000.500
2
1000
999.750
1000.250
2
500
499.875
500.125
2
200
199.950
200.050
2
100
99.975
100.025
2
50
49.988
50.012
2
20
19.995
20.005
Chapter 9
Actual
261
Performance Test Records
AF Analyzer AC Level Accuracy Performance Test 12 Record
AF Analyzer AC Level Accuracy
Performance Test 12 Record
For test procedure, see “AF Analyzer AC Level Accuracy Performance
Test 12” on page 201.
Table 9-12
Frequency
(Hz)
AF Analyzer AC Voltage Accuracy Test 12 Record
Level
(mV)
AC Voltage Limits (mV)
Lower
Upper
15000
5000
4849.550
5150.450
2000
5000
4849.550
5150.450
200
5000
4849.550
5150.450
20
5000
4849.550
5150.450
15000
500
484.550
515.450
2000
500
484.550
515.450
200
500
484.550
515.450
20
500
484.550
515.450
15000
50
48.050
51.950
2000
50
48.050
51.950
200
50
48.050
51.950
20
50
48.050
51.950
262
Actual
Chapter 9
Performance Test Records
AF Analyzer Residual Noise Performance Test 13 Record
AF Analyzer Residual Noise
Performance Test 13 Record
For test procedure, see “AF Analyzer Distortion and SINAD Accuracy
Performance Test 14” on page 203.
Table 9-13
AF Analyzer Residual Noise Test 13 Record
Residual Noise Limits (µV)
Filter 2
Upper
15 kHz LPF
150
>99 kHz LP
450
Chapter 9
Actual
263
Performance Test Records
AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14 Record
For test procedure, see “AF Analyzer Distortion and SINAD Accuracy
Performance Test 14” on page 203.
Table 9-14
AF Analyzer Distortion and SINAD Accuracy Test 14 Record
AF
Generator 2
Frequency
(kHz)
AF Generator
2 Level (mV)
2
100
Distortion
2
100
SINAD
3
100
Distortion
3
100
SINAD
2
10
Distortion
2
10
SINAD
3
10
Distortion
3
10
SINAD
2
5
Distortion
2
5
SINAD
3
5
Distortion
3
5
SINAD
Measurement
Type
Distortion and SINAD Limits
Lower
264
Upper
8.856%
11.144%
19.043 dB
21.043 dB
8.856%
11.144%
19.043 dB
21.043 dB
0.890%
1.120%
39.000 dB
41.000 dB
0.890%
1.120%
39.000 dB
41.000 dB
0.445%
0.560%
45.021 dB
47.021 dB
0.445%
0.560%
45.021 dB
47.021 dB
Actual
Chapter 9
Performance Test Records
AF Analyzer DC Level Accuracy Performance Test 15 Record
AF Analyzer DC Level Accuracy
Performance Test 15 Record
For test procedure, see “AF Analyzer DC Level Accuracy Performance
Test 15” on page 204.
Table 9-15
AF
Generator
1 Level
(mV)
AF Analyzer DC Level Accuracy Test 15 Record
DC Voltage Limits (mV)
Lower
Upper
5000
4905.000
5095.000
500
450.000
550.000
Chapter 9
Actual
265
Performance Test Records
AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16 Record
For test procedure, see “AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16” on page 205.
Table 9-16
Frequency
(Hz)
AF Analyzer Frequency Accuracy to 100 kHz Test
16 Record
Frequency Limits (Hz)
Lower
Upper
20
19.896
20.104
100
99.880
100.120
1000
999.700
1000.300
10000
9997.90
10002.10
100000
99979.9
100020.1
266
Actual
Chapter 9
Performance Test Records
AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17 Record
For test procedure, see “AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17” on page 206.
Table 9-17
AF Analyzer Frequency Accuracy at 400 kHz Test
17 Record
Frequency Difference Limits (kHz)
Lower
Upper
−0.080
0.080
Chapter 9
Actual
267
Performance Test Records
Oscilloscope Amplitude Accuracy Performance Test 18 Record
Oscilloscope Amplitude Accuracy
Performance Test 18 Record
For test procedure, see “Oscilloscope Amplitude Accuracy Performance
Test 18” on page 208.
Table 9-18
Frequency
(kHz)
Oscilloscope Amplitude Accuracy Test 18 Record
Amplitude Limits (V)
Lower
Upper
1
6.765
7.377
10
6.765
7.377
50
5.000
10.000
268
Actual
Chapter 9
Performance Test Records
RF Analyzer Level Accuracy Performance Test 19 Record
RF Analyzer Level Accuracy
Performance Test 19 Record
For test procedure, see “RF Analyzer Level Accuracy Performance Test
19” on page 210.
Table 9-19
Frequency
(MHz)
RF Analyzer Level Accuracy Test 19 Record
Level Difference Limits (dB)
Lower
Upper
30
−0.531
0.531
50
−0.531
0.531
100
−0.531
0.531
150
−0.531
0.531
200
−0.531
0.531
250
−0.531
0.531
300
−0.531
0.531
350
−0.531
0.531
400
−0.531
0.531
450
−0.531
0.531
500
−0.531
0.531
550
−0.531
0.531
600
−0.531
0.531
650
−0.531
0.531
700
−0.531
0.531
750
−0.531
0.531
800
−0.531
0.531
850
−0.531
0.531
900
−0.531
0.531
950
−0.531
0.531
1000
−0.531
0.531
1700
−0.531
0.531
1725
−0.531
0.531
Chapter 9
Actual
269
Performance Test Records
RF Analyzer Level Accuracy Performance Test 19 Record
Table 9-19
Frequency
(MHz)
RF Analyzer Level Accuracy Test 19 Record
Level Difference Limits (dB)
Lower
Upper
1750
−0.531
0.531
1775
−0.531
0.531
1800
−0.531
0.531
1825
−0.531
0.531
1850
−0.531
0.531
1875
−0.531
0.531
1900
−0.531
0.531
1925
−0.531
0.531
1950
−0.531
0.531
1975
−0.531
0.531
2000
−0.531
0.531
270
Actual
Chapter 9
Performance Test Records
RF Analyzer FM Accuracy Performance Test 20 Record
RF Analyzer FM Accuracy
Performance Test 20 Record
For test procedure, see “RF Analyzer FM Accuracy Performance Test
20” on page 211.
Table 9-20
RF Analyzer FM Accuracy Test 20 Record
RF (MHz)
Deviation
(kHz)
Rate
(Hz)
FM Deviation Limits (kHz)
Lower
Upper
12.5
1
50
0.960
1.040
12.5
1
1000
0.960
1.040
12.5
1
25000
0.960
1.040
12.5
10
50
9.600
10.400
12.5
10
1000
9.600
10.400
12.5
10
25000
9.600
10.400
400
10
50
9.600
10.400
400
10
1000
9.600
10.400
400
10
25000
9.600
10.400
400
17
50
16.320
17.680
400
17
1000
16.320
17.680
400
17
25000
16.320
17.680
Chapter 9
Actual
271
Performance Test Records
RF Analyzer FM Distortion Performance Test 21 Record
RF Analyzer FM Distortion
Performance Test 21 Record
For test procedure, see “RF Analyzer FM Distortion Performance Test
21” on page 213.
Table 9-21
FM Deviation
(kHz)
RF Analyzer FM Distortion Test 21 Record
FM Distortion Limits (%)
Upper
5
1.000
25
1.000
75
1.000
272
Actual
Chapter 9
Performance Test Records
RF Analyzer FM Bandwidth Performance Test 22 Record
RF Analyzer FM Bandwidth
Performance Test 22 Record
For test procedure, see “RF Analyzer FM Bandwidth Performance Test
22” on page 215.
Table 9-22
RF Analyzer FM Bandwidth Test 22 Record
FM Deviation
Difference Limits (dB)
Upper
Actual
3.0
Chapter 9
273
Performance Test Records
RF Analyzer Residual FM Performance Test 23 Record
RF Analyzer Residual FM
Performance Test 23 Record
For test procedure, see “RF Analyzer Residual FM Performance Test 23”
on page 217.
Table 9-23
RF Analyzer Residual FM Test 23 Record
FM Deviation Limits
(Hz)
Upper
Actual
7.0
274
Chapter 9
Performance Test Records
Spectrum Analyzer Image Rejection Performance Test 24 Record
Spectrum Analyzer Image Rejection
Performance Test 24 Record
For test procedure, see “Spectrum Analyzer Image Rejection
Performance Test 24” on page 219.
Table 9-24
Spectrum Analyzer Image Rejection (Image) Test 24
Record
RF Generator
Frequency
(MHz)
Spectrum
Analyzer
Frequency (MHz)
Image Response Limits
(dB)
Upper
613.6
385.0
−50
873.6
645.0
−50
883.6
655.0
−50
1023.6
795.0
−50
1000.0
771.4
−50
576.4
805.0
−50
771.4
1000.0
−50
319.02
300.0
−50
Table 9-25
Spectrum Analyzer Image Rejection (Residual) Test
24 Record
Spectrum
Analyzer Center
Frequency (MHz)
Residual Response
Limits (dBm)
Upper
5.534
−70
10.0
−70
20.0
−70
21.4
−70
107.126
−70
164.28
−70
257.139
−70
271.4
−70
347.607
−70
Chapter 9
Actual
Actual
275
Performance Test Records
Spectrum Analyzer Image Rejection Performance Test 24 Record
Table 9-25
Spectrum Analyzer Image Rejection (Residual) Test
24 Record
Spectrum
Analyzer Center
Frequency (MHz)
Residual Response
Limits (dBm)
Upper
500.0
276
Actual
−70
Chapter 9
Performance Test Records
CDMA Generator Amplitude Level Accuracy Performance Test 25 Record
CDMA Generator Amplitude Level Accuracy
Performance Test 25 Record
For test procedure, see “CDMA Generator Amplitude Level Accuracy
Performance Test 25” on page 221.
Table 9-26
RF (MHz)
CDMA Generator RF In/Out Test
Level
(dBm)
Measured Level Limits (dBm)
Lower
Upper
836.52
−10
−11.5
−8.5
836.52
−11
−12.5
−9.5
1851.25
−11
−12.5
−9.5
1851.25
−12
−13.5
−10.5
Chapter 9
Actual
277
Performance Test Records
CDMA Generator Modulation Accuracy Performance Test 26 Record
CDMA Generator Modulation Accuracy
Performance Test 26 Record
For test procedure, see “CDMA Generator Modulation Accuracy
Performance Test 26” on page 223.
Table 9-27
RF (MHz)
CDMA Generator Modulation Accuracy Test 26
Record
Level
(dBm)
Measured
EVM
(%rms)
Calculated Rho
Lower
Limit
836.52
−10
0.96
1851.25
−10
0.96
278
Actual
Chapter 9
Performance Test Records
CDMA Analyzer Average Power Level Accuracy Performance Test 27 Record
CDMA Analyzer Average Power Level Accuracy
Performance Test 27 Record
For test procedure, see “CDMA Analyzer Average Power Level Accuracy
Performance Test 27” on page 225.
Table 9-28
RF
(MHz)
CDMA Analyzer Average Power Level Accuracy
Test 27 Record
Level
(mW)
Measured Level Limits (mW)
Lower
Upper
Actual
881.52
4
3.65
4.35
881.52
10
9.20
10.80
1931.25
4
3.65
4.35
1931.25
10
9.20
10.80
Chapter 9
279
Performance Test Records
CDMA Analyzer Channel Power Level Accuracy Performance Test 28 Record
CDMA Analyzer Channel Power Level Accuracy
Performance Test 28 Record
For test procedure, see “CDMA Analyzer Channel Power Level
Accuracy Performance Test 28” on page 227.
Table 9-29
RF
(MHz)
CDMA Analyzer Channel Power Level Accuracy
Test 28 Record
Level
(dBm)
Measured Level Limits (dBm)
Lower
Upper
881.52
11
10.25
11.75
881.52
6
5.25
6.75
881.52
1
0.25
1.75
881.52
−4
−4.75
−3.25
881.52
−9
−9.75
−8.25
881.52
−14
−14.75
−13.25
881.52
−19
−19.75
−18.25
1931.25
11
10.25
11.75
1931.25
6
5.25
6.75
1931.25
1
0.25
1.75
1931.25
−4
−4.75
−3.25
1931.25
−9
−9.75
−8.25
1931.25
−14
−14.75
−13.25
1931.25
−19
−19.75
−18.25
280
Actual
Chapter 9
Performance Test Records
CDMA Analyzer Modulation Accuracy Performance Test 29 Record
CDMA Analyzer Modulation Accuracy
Performance Test 29 Record
For test procedure, see “CDMA Analyzer Modulation Accuracy
Performance Test 29” on page 229.
Table 9-30
RF (MHz)
CDMA Analyzer Modulation Accuracy Test 29
Record
Level
(dBm)
Calculated Rho Error
Lower
Limit
Upper
Limit
881.52
−10
−0.005
0.005
1931.25
−10
−0.005
0.005
Chapter 9
Actual
281
Performance Test Records
CDMA Analyzer Modulation Accuracy Performance Test 29 Record
282
Chapter 9
10
Block Diagrams
This chapter contains block diagrams and descriptions that focus on
how the Test Set generates signals and makes measurements. It also
has I/O signal and pin number information that can be used to help
isolate a problem to the assembly level if the Test Set’s diagnostic
programs are unable to do so.
283
Block Diagrams
Introduction
Introduction
Shown in Figure 10-1 on page 285 is a block-diagram overview of the
Test Set. This chapter is organized into the following sections which
provide a detailed view of each individual assembly shown in the
overview:
• RF Input/Output
• RF Analyzer
• Audio Analyzer
• CDMA Analyzer
• CDMA Generator
• Audio Generator
• RF Generator
• Reference/Regulator
• Instrument Control
Input/output and switch information is included to help you determine
if voltages and signals are getting to the assemblies with the proper
levels, shapes, and frequencies. Line names and connector pin numbers
are given on the block diagrams when applicable.
284
Chapter 10
ANT
IN
Input
Attenuator
OPP
Receiver &
Demod
IF
(FM, AM, SSB)
A2A21
Downconverter
A2A115
RF
IN/OUT
Spectrum
Analyzer
A2A20
Audio
Analyzer
SCOPE MONITOR OUT
A2A40
A2A80
AUDIO IN
Measurement
(Scope)
(Voltmeter)
(Counter)
100 W
Attenuator
A2A200
RPP
Output
Attenuator
EXT AC
Input
RF I/O
A2A130
Signaling
Analyzer
A2A32
LO/IF
Conversion
A2A120
Regulators
A3A1
Power Supplies
EXT SCOPE TRIGGER IN
A2A33
Audio Analyzer
Splitter
RF Analyzer
DUPLEX
OUT
Volume
(Bandpass
Filters)
(Distortion)
Power
Detector
DC
Block
Speaker
Receive
DSP
A2A36
CDMA Analyzer
CDMA Clocks
HP-IB
Control
Interface
A2A70
Serial Ports
Parallel Ports
Reference
Controller
A2A31
A2A23
Memory/
SBRC
A2A30
Data Buffer
Modulator
A2A34
Display
Drive
A2A50
CDMA Generator
EL Display
Upconverter
A2A110
t
VIDEO OUT
PCMCIA Memory Card
PCMCIA
Controller
A2A10
CDMA
Generator
Reference
A2A100
Output
Section
A2A24
Inst. Control
RPP - Reverse Power Protection
SBRC - Serial Bus Receiver Chip
285
Note: DC Block ID is AC Couple on RF In/Out connector (side panel)
Sig Gen
Synth
A2A25
RF Generator
Signaling
Source
A2A32
TRIGGER QUALIFIER IN
10 MHz REF OUT
BASEBAND OUT
Serial Data
ANALOG MODULATION IN
Audio Generator
Block Diagrams
Introduction
OPP - Over Power Protection
IQ
Mod
A2A120
Mod
Distribution
A2A44
EVEN SECOND SYNC IN
EXT REF IN
Test Set Overview Block Diagram
Chapter 10
Receiver
Synth
A2A22
Squelch
Figure 10-1
CDMA BASE STATION TEST SET OVERALL BLOCK DIAGRAM
Block Diagrams
RF Input/Output Section
RF Input/Output Section
RF Power Measurement
An RF power measurement can only be made by supplying a signal to
the RF IN/OUT port of the Test Set. See Figure 10-2 on page 287. A
power splitter then splits the signal between an RF analysis path and a
power measurement path. The power detector has a direct path to the
A2A36 Receive DSP where average power measurements are made.
There’s also a diode peak detector to provide a peak power
measurement through the A2A33 Measurement assembly.
Accuracy is insured by factory-generated calibration data which is
stored in CAL ROM. The A2A200 100W-attenuator also has calibration
data which affects RF power measurements.
Input Gain Control
Step attenuators in the A2A130 Input/Output Section are switched in
and out, manually or automatically. This keeps the input level within
an optimum range for the mixers, IF amplifiers, and detectors.
286
Chapter 10
Figure 10-2
J4
SMA
J5
OVER
POWER
PROTECT
0-35 dB
ATTEN
50
100W
ATTENUATOR
A2A200
50
-22 dB
HIGH
POWER
PAD 16 dB
SMA
SMA
DET_OUT
TO
SMB RCV_DSP
POWER
DETECTOR
4V PK
-12 dB
J3
J7
50
50
-6 db
TO RF
IN/OUT
SMA
0 dB
5 dB
STEPS
CONTROL
50
SMA
DC Block
J6
TO DUPLEX
OUT
SMA
REVERSE
POWER
PROTECT
ATTENUATOR
DRIVE LOGIC
50
TO
DOWNCONVERTER
RF Input/Output Assembly, A2A130
Chapter 10
FROM
ANT IN
7
J2
CAL
EEPROM
ANALOG
MUX
GND
+15V
+12V
5 dB
STEPS
-12V
SMA
0-125 dB
STEP
ATTEN
+5V
FROM
UPCONVERTER
SERIAL
IO
Block Diagrams
RF Input/Output Section
287
PEAK_POWER
EN/I
CLOCK
DATA
RIBBON
CABLE
Block Diagrams
RF Analyzer Section
RF Analyzer Section
Frequency Conversion
The A2A115 Downconverter, see Figure 10-3 on page 290, produces an
IF of 114.3, 385.7 or 614.3 MHz. The LO is provided by the A2A22
Receiver Synthesizer, see Figure 10-4 on page 291. The IF frequencies
developed are as follows in Table 10-1.
Table 10-1
IF Frequencies
Input RF (MHz)
1st LO (MHz)
IF (MHz)
0 to 385.7
614.7 to 1000
614.3
385.7 to 800
500 to 914.3
114.3
800 to 1000
685.7 to 885.7
114.3
1400 to 2200
1014.3 to 1814.3
385.7
Filters are automatically switched in to remove image and other
interfering signals. The frequency ranges of the filters are as follows:
• 150 MHz low-pass
• 150 MHz - 386 MHz bandpass
• 350 MHz - 650 MHz tunable bandpass
• 650 MHz - 1000 MHz tunable bandpass
• 1400 MHZ - 2200 MHz tunable bandpass
Modulation Measurement
The A2A21 Receiver assembly demodulates the IF into its FM, AM, and
SSB components, see Figure 10-5 on page 292. The demodulated signal
is sent to the Audio Analyzer section for measurement.
288
Chapter 10
Block Diagrams
RF Analyzer Section
Spectrum Analysis
The LO on the A2A20 Spectrum Analyzer is swept across the span by
the Controller, see Figure 10-6 on page 293. The LO starts sweeping
when the oscilloscope circuits on the A2A33 Measurement board trigger
the display sweep to start. As the LO sweeps, the spectrum analyzer
filters and then amplifies the IF signal in a logarithmic detector so the
signal voltage will be proportional to the log of power. The signal
voltage is measured by a sampler on the Measurement board and
displayed.
Spectrum analyzer resolution bandwidth is determined by switching
bandwidth IF filters on the A2A20 Spectrum Analyzer. These filters are
set by the Controller as a function of the span selected from the front
panel.
Chapter 10
289
Figure 10-3
3 dB
2-12 dB PAD
1400
385.7 MHz
2200
MHz
TUNE 3
TUNE 2
SMA
FROM
RF/IO
1
+13 dBm
ATTEN SET
TO MUX
DOUBLED_LO_LEVEL
_ -10 dBm
<
1200-1620 MHz
TO MUX
HIGH_BAND_DET
X2
5 dB ATTEN
1826-2647 MHz
1826-2647
150 MHz
PINS
1600-2000 MHz
PINS
386
MHz
150
MHz
J3
2-12 dB
+12 dB
6 dB PAD
8 dB
<
_ -16 dBm
600 1000
MHz
700 MHz
TUNE 1
TUNE 3
ATTEN
SET
BPF SEL
LB_RF_DIAG
+7 dBm
MIN
614.3 MHz
TO MUX
TUNE 2
IF_PKPWR_DET
DAC
TO MUX
LOW_BAND_DET
-5 V
-9 V
-10 V
HI-SPEED
IO
+9 V
5
AUTORNG
DACS
-12.37 V
CAL
EEPROM
+30 V
BPF SEL
NORMAL_MODE
-5 V_REF
DAC
+12.37 V
DAC
TO
RECEIVER
SMB
114.3 MHz
350
650 MHz
DAC
12-15 dBm
+0 dBm
HB_RF_DIAG
LB_RF_DIAG
VOLTAGE
MUX
+5.1 V
TO MUX
POWER SUPPLY
+5 V_REF
RF_DIAG
DOWN-TEMP_SENSE
FILTERS/REGULATORS
GND
+5 A(+5.1 V)
-12 A(-12.37 V)
+12 A(+12.37 V)
+9 V
+40 V
DNCNV_DIAG
DNCNV_SBRC_EI
DNCNV_SBRC_DATA
Chapter 10
DNCNV_SBRC_CLK
RIBBON
J2
FROM
RCVR SYNTH
SMB
Block Diagrams
RF Analyzer Section
HB_RF_DIAG
TUNE 1
Downconverter Assembly, A2A115
290
J1
DCNV_IN
2 dB
Block Diagrams
RF Analyzer Section
Figure 10-4
Receiver Synthesizer Assembly, A2A22
RECEIVER SYNTHESIZER ASSEMBLY, A2A22
1500MHz
REF PRESENT
GAIN CTRL
4
REF
PRESENT
DET
27dB
14dB
O
27dB
OUT OF
LOCK
DET
-..- 2
BUFFER
LOOP
CONTROL
GAIN
CONT
CONTROL
4
FROM
MEAS
OUT OF LOCK
EN/I
D
REF PRESENT
CK
SWP STRT RCVR
GND
-12.4
A
+5.1
A
+12.4
A
1MHz
FROM REF
+40V
+43.5
3
500-1000 MHz
0dBm
GROUP
SERIAL I/O
P/O MOTHERBOARD A2A1
J2
SMB
TO DOWNCONVERTER
Chapter 10
291
Figure 10-5
SQUELCH
LVL
IF FILTER
SELECT
OFFSET
ZERO
PRESET
X
+7
dBm
+7 dBm
10.7 MHz
CF
14 dB
GAIN
INV1
AMP
AM
DEMOD
0 dB
500 MHz LO
DEMOD OUT SELECT
SQUELCH LEVEL
ALC ON/OFF
IF1 FILTER SELECT
IF1 SELECT
TRACKING
SSB
DEMOD
125 MHz
TO SQUELCH
300 kHz
LPF SQUELCH
FREQ
BFO
ON/OFF
DEMOD OUTPUT
SELECT
10M Hz REF
EN/I
GND
-12.4
+5.1
10 MHz REF
TO SSB BFO
& FM DEMOD
+12.4
IF PRESENT
D
X
ALC
REF
UP SQUELCH
CK
AM
DET
ALC
ALC
SSB BFO SYNTH FREQ
SQUELCH
10 MHz
REF
280 kHz
BW
5 dB PAD
.
-. 4
UP
SQUELCH
9 dB
1ST-IF
(FROM
GROUP
DOWNSERIAL I/O
CONVERTER)
FROM
REFERENCE
Chapter 10
P/O MOTHERBOARD A2A1
114.3 MHz REF.
FROM
TO SSB BFO
REFERENCE & FM DEMOD
114.3 MHz
IF OUT
+- 5 MHz
A A A
DEMOD OUTPUT
AUDIO ANALYZER 1
700 kHz
IF CNT
>100 mV
TO CNTR
Block Diagrams
RF Analyzer Section
10 dB
7dB
FM
DISC
LIM
X
X
+14 dB
FM
DEMOD
LC
LC
4 dB PAD
15 kHz OR
30 kHz BW
ADJ
ADJ
Receiver Assembly, A2A21
292
IF1 SELECT
CAL
EN
BW
114.3 MHz
BPF
PAD
11.26 MHz
PAD
-8 dB
+8 dB
VARIABLE
GAIN
BW
O, 10,
20 dB
Figure 10-6
GAIN
20 dB
GAIN
TEMP
X
COMP
Spectrum Analyzer Assembly, A2A20
Chapter 10
1 MHz BW
TUNE
TC
110 MHz
+7 dBm
(TO SCOPE)
LOG
AMP
LOOP
BW
500Hz
3
16/17
0, 5, 10 dB
TEMP COMP
BW
TUNE
DACS (3)
GAIN
CAL
EN
TUNE
+2
OUT OF LOCK
CAL
EN
-8 dB
BW
+8 dB
CYCLE SLIP
VARIABLE
GAIN
RUN
IO
SYNTH
3
GAIN
DAC
TUNE
GAIN
NC
CONTROL
SA_SCP3
SA_SCP2
GND
+5.1
(TO MEAS
BOARD)
P/O MOTHERBOARD A2A1
293
SMB
Block Diagrams
RF Analyzer Section
A
A
GROUP
SERIAL IO
A
20 MHz FROM
REFERENCE
+12.4
FROM
RECEIVER
SWEEP
START
SA
FROM
SCOPE
-12.4
20 MHz
Block Diagrams
Audio Analyzer Section
Audio Analyzer Section
Input Level Control
Switchable gain amplifiers on the A2A80 Audio Analyzer #1 (see Figure
10-7 on page 295) and A2A40 Audio Analyzer #2 (see Figure 10-8 on
page 296) assemblies keep the audio input signal within a range
suitable for the detectors.
AC and DC Level Measurements
Detected voltages from the Peak+, Peak −, and RMS detectors are
measured on the A2A33 Measurement assembly. The Controller
calculates the displayed value taking into account the detector selected
from the front panel, the gain of the amplifiers, and the source of the
input signal (demodulators, front panel).
Distortion and SINAD Measurements
Distortion and SINAD can be measured on 300 Hz to 10 kHz audio
signals. The Controller calculates distortion and SINAD by comparing
the ratio of the voltage after the variable notch filter to the ratio of the
voltage before the notch filter.
Oscilloscope Functions
The Test Set has no specialized oscilloscope assemblies. The A2A80 and
A2A40 Audio Analyzer assemblies, A2A33 Measurement assembly, and
the Controller work together to perform the oscilloscope functions.
The audio or dc signal to be displayed goes from the A2A40 Audio
Analyzer 2 assembly to a sampler on the A2A33 Measurement
assembly (the same sampler used by the Spectrum Analyzer). The
Controller calculates the display level by taking the value of the
measured signal at each point of the sweep, the gain of the signal path
in the Audio Analyzer assemblies, and the volts-per-division setting.
The oscilloscope’s trigger signals from the side-panel connector, the
A2A32 Signaling Source/Analyzer assembly, and the internal trigger
signal are used by the A2A33 Measurement assembly and the
Controller to determine when to start the scope sweep. The Controller
adds the pre-triggering time entered from the front panel.
294
Chapter 10
Figure 10-7
FILTER 2 SELECT
FILTER 1 SELECT
LF INPUT SELECT
50 Hz
300 Hz
FILTERED
AUDIO
OUT
0/20/40
GAIN
AMP
AUX 1
300 Hz
3 kHz
A3A1
OPT
15 kHz
TO
AUDIO
ANALYZER 2
AUX 2
MON
OUT
FROM
MOD DIST
AUX 3
FREQ
CNT
FIL ID 1
FIL ID 2
PEAK
DET
INPUT
VOLTAGE
MEAS
AUDIO IN LO
TO
VOLTMETER
RESET PK
+
-
FIL 2 SEL
FIL 1 SEL
GAIN=1
LF GAIN 1
FLOT/GND
INP SEL
+- 10
AUDIO IN HI
INPUT PEAK VOLTAGE
TO MEASUREMENT
A3A2
A3A3
OPT
AUX 4
Audio Analyzer 1, A2A80
Chapter 10
FROM RCVR
DEMOD
DC-25 kHz
OVER VOLTAGE
FLOAT/
GND
IO
GROUP
SERIAL IO
295
Block Diagrams
Audio Analyzer Section
EN/I
D
CK
GND
+5.1
-12.4
+12.4
B B A
BY-PASS TO
AUDIO ANALYZER 2
3 PIN
KEYBOARD
SPKR
8 Ohms
TO MEAS
POS PEAK
VOLTAGE OUT
100 kHz
-PEAK
0/10/20/30
HI/LOW BEEP
AUDIO
MEAS
TO
VOLTMETER
NEG PEAK
VOLTAGE OUT
SETTLE
RESET
RMS
DET
KEYBOARD
PRE-NOTCH RMS
+
-
TIME
CONST
212 Hz
TIME CONST 0.1
0/20 dB/40 dB
PK DET RESET
PEAK
EXP SEL
PK DET SEL
FREQ. NOTCH
VARIABLE
0/10/20/30/40 dB
BEEP/
AUDIO
+
-
POST NOTCH
RMS
RMS
DET
TIME
CONST
SERIAL I/O
ALC
BEEP
VOLUME OFF
SCOPE
MONITOR
OUT
AUDIO MEASUREMENT SELECT
3 PIN
ANALYZED AUDIO OUT SELECT
DE-EMP
100 W
GND
-12.4
+5.1
+12.4
EN/I
D
CK
Chapter 10
B B A
FRONT PANEL
VOLUME
ALC/
THRU
I.O.
GROUP SERIAL I/O
BEEP FROM
CONTROLLER
DC MEAS.
TO SIGNAL
ANAL
TO SCOPE
Block Diagrams
Audio Analyzer Section
+PEAK
Audio Analyzer 2, A2A40
296
PEAK DET. SELECT
FROM
AUDIO
ANALYZER 1
Figure 10-8
HEADPHONE CONNECTOR
Figure 10-9
MEASUREMENT ASSY.
CRT_MEAS_BUS
A2A33
5
SIGNAL TRIGGER
FROM SIG. SRC & ANAL.
16
7
EXT. TRIGGER
0 TO 5V (R.P.)
I/O FROM
CONTROLLER
SCOPE
RAM
GREF_CNT_INOUT
AUDIO CNT
A-D
CNTR
MUX
DIGITAL
CONTROL
STATEMACHINE
ANALOG
MEAS
700 kHz IF CNT
20 MHz
FROM REF
SECT
+10 dBm
GAIN
&
OFF
SET
S
C
O
P
E
M
U
X
TRIG_IN
AUDIO OUTPUT
(FROM AUDIO ANALYZER 2)
SA_SCP
SA_SCP2
SA_SCP3
DET_LO
IN_VOLT
TO SPECT.
ANALYZER
FROM RFIO
+5
..2
-12.4
+12.4
+5 VA
GND
X
TRIG_OUT
TRIGGER
TRIGGER
LEVEL
MEAS_SBRC
(FROM MEMORY_SBRC)
GENREF_SCP_TRIGGER
SWP STRT SG
SWP STRT RCVR
SWP STRT SA
VOLTMETER MUX
297
Block Diagrams
Audio Analyzer Section
+12.4 VA
+40 V
+5 VD
+9 V
+12 CRT
OS DIAG
1000MHz DIAG
500MHz DIAG
LFS2
LFS1
AUDIO MEASURE
RI_VM_ID
LOIF_DIAG
SPEC ANAL
DNCNV_DIAG
G_REF_DIAG
UPCENV_DIAG
CURRENT SENSE
+5VA
AUDIO INPUT MEAS
D B A
Measurement Assembly, A2A33
Chapter 10
TRIG
MUX 1
TRIG
MUX 2
Figure 10-10
SIGNALING SOURCE & ANALYZER ASSEMBLY, A2A32
GATED BUS
FROM
MEMORY SBRC
INTFC
UPC
i8051
E
P
R
O
M
RAM
LFS1
NSM
DIAG
DAC
LFS2
GLUE
LFS GND
PROCESSING
-12.4
+5.1
+12.4
GND
GND ANALOG
FILTERS
GND
DIGITAL
SIGNALING
AUDIO FROM
AUDIO ANALYZER 2
D B A GND
TRIGGER
TO
SCOPE
Block Diagrams
Audio Analyzer Section
DAC
12
MHz
Signal Source & Analyzer Assembly, A2A32
298
DIAG
6.78 MHz
Chapter 10
Block Diagrams
CDMA Analyzer Section
CDMA Analyzer Section
IF Conversion
To down convert the CDMA the signal, the 114.3 MHz IF is mixed with
a 110.6136 MHz LO to produce a 3.6864 MHz IF in the A2A120 LO
IF/IQ Modulator assembly, see Figure 10-11 on page 300. The oscillator
that produces the LO signal is phase locked to a 10 MHz signal from the
A2A100 CDMA Generator Reference assembly, see Figure 10-13 on
page 303.
CDMA Signal Analysis
The 3.6864 MHz signal goes to the A2A36 Receive DSP assembly, see
Figure 10-12 on page 301. The Receive DSP assembly analyzes the
3.6864 MHz signal to make IQ modulation measurements, such as rho,
timing accuracy, carrier feed through, and phase error.
Power Measurements
The A2A36 Receive DSP assembly also makes average power
measurements through a direct link from the A2A130 RF Input/Output
assembly.
Chapter 10
299
Block Diagrams
CDMA Analyzer Section
Figure 10-11
LO IF/IQ Modulator Assembly, A2A120
LO IF Conversion
POWER TO
IQ MODULATOR
TO RECEIVER DSP
3
SMB
3.6864
MHz IF
PWR
+5 +12 -12 -5
3.6864
MHz
7 MHz .2 dB
15.6 MHz NOTCH
X
SMB
(FROM CDMA
GEN/REF)
S
E
R 15
I
A
L
110.6136
MHz
10 MHz
REF IN
114.3
IF
+10
O
8/9
LOOP
-.. NF
CONTROL
RIBBON
TO
MOTHERBOARD
DIAG
MUX
SMB
(FROM RECEIVER)
300
Chapter 10
Figure 10-12
RECEIVE DSP ASSEMBLY, A2A36
100 ohm
SMB
DET_OUT
FROM
RF IO ASSY
33 MHz
256K FAST RAM
-10 TO +30 dB
GAIN
8 MHz
12
12 BIT
ADC
DE-MUX
1
INTO
1
NC
SERIAL PORT 1
6
SERIAL PORT 2
6
NC
6
TCLKO/1
2
12 TO 24
32
SMB
PRIMARY
BUS DATA
XF1
INTMED
MUX
Fs
TMS320C30
ADDR
24
SAMPLE
CLOCK
GENERATOR
NC
DSP
3
Fs/2
EXT
Fs SMB
(FROM
CDMA GEN/REF)
D_RCV_
DSP_TRIG
RESET
NC
ADDR
DECODE
EXP BUS
DATA
LATCHES
(4)
1
DIAG
NC
Receive DSP Assembly, A2A36
Chapter 10
128K FLASH
EPROM
31
EXT TRIGGER
NC
TRIG
CKT
512x8
BI-FIFO
DATA
BUFFER
INT0, INT1
PWR
+- 15. +- 5 V
2
NC
301
Block Diagrams
CDMA Analyzer Section
DAC
TRIG_OUT NC
14
Block Diagrams
CDMA Generator Section
CDMA Generator Section
Data Generation
The A2A34 Data Buffer, see Figure 10-14 on page 304, generates or
buffers external data that emulates a CDMA traffic channel and
outputs this data to the A2A100 CDMA Generator Reference, see
Figure 10-13 on page 303. The CDMA Generator Reference assembly
converts the data into I and Q drive signals and sends it back to the
Data Buffer to be summed with calibrated noise sources. The signals
are then passed to the A2A120 LO IF/IQ Modulator for modulation with
RF.
CDMA Reference
The A2A100 CDMA Generator Reference, see Figure 10-13 on page 303,
supplies all the CDMA clocks for the A2A36 Receive DSP and the
A2A34 Data Buffer. The CDMA Generator Reference also provides
reference switching for an external or the internal reference source.
302
Chapter 10
TO IQ MODULATOR
QUAD
ADJ
TO DATA BUFFER
I
SMB
QUADRATURE
8
Q
I_OFFSET
8
Q_OFFSET
3 dB
MOD_DATA
I_OUT (9.0)
REV
Q_OUT (9.0)
EVEN_SEC
SYNC
CKT
FWD
ASIC
LOGIC
TO DATA
BUFFER
CASS_STROBE
2_SEC
D_RCV_DSP_TRIG
TO RECEIVE
DSP
SER_CLOCK
80_MS
10 PIN N.C.
20_MS
26.67_MS
SER_DATA
TRIGGER
QUALIFIER
IN
4X CHIP TO
RECEIVE DSP
1.2288 MHz OUT
CHIP CLK
SIDE PANEL
FRAME CLOCK OUT
4X CHIP
SMB
19.6_CLK
SIDE PANEL
PARALLEL
TO
SERIAL
INTERFACE
J3
10 MHz TO LO
O
I/R
J3
+58UF
POWER
SENSE/
REGULATOR
GATED BUS
BUFFER
I/R
O
16X CHIP CLOCK
1/NF
CH_B_DIAG
DIAG
MUX
REF CLOCK
CDMA_TUNE
SYNTH_TUNE
LO/IF_DIAG
DIAGNOSTIC MONITOR OUT
J2
MOTHERBOARD
303
EXT
10 MHz
REF OUT REF IN
MOTHERBOARD TO
REFERENCE
TO KEYBOARD
TO MEASUREMENT BOARD
MOTHERBOARD
TO DATA BUFFER
Block Diagrams
CDMA Generator Section
10 MHz OUT
10 MHz REF OUT
REF
SWITCHING
REF_IN
CLOCKS
+50
10 MHz REF OUT
+12AUX
-5V
+5
+5
+15 PWR +12
-15
-12
19.6608 MHz OUT
10 MHz TO CDMA
CLOCK CKT
1/NF
POWER
SUPPLY
TO LO/IF
DIVIDERS
CDMA Generator/Reference Assembly, A2A100
Chapter 10
8
SMB
8
SERIALDATA
IN
SMB
EVEN
SECOND/
SYNC IN
SIDE
SMB
PANEL
J3
SMB
3 dB
SMB
NC
Figure 10-13
CDMA GENERATOR/REFERENCE ASSEMBLY, A2A100
Figure 10-14
TO IQ MODULEATOR
I
SMB
SMB
SMB
I
16X CHIP
Q SIGNAL CONTROL
DAC
GAUSSIAN TABLE/
BUFF/MODNOISE
CONFIG
I SIGNAL CONTROL
FROM
MEMORY/
SBRC
PARALLEL
OUTPUTS
DATA
BUFFER
DAC
I SIGNAL
GAIN DELTA
128Kx8
128Kx16
FLASH
SRAM
DAC
MODNOISE
BUFF
CLOCK/SYNC FROM GEN/REF BD
DATA
BUFFER
CONTROL
SERIAL BUS
EMO
SERIAL
s_CLK
s_DATA
I.O.
STATUS/
READBACK
CONTROL
SMB
NOISE
SOURCE
12
SERIAL
DATA
1 MHz
12
CDMA
REVERSE
LINK
MODULATOR
DAC
BASEBAND
OUTPUT
(SIDE PANEL)
1 MHz
SMB
PARALLEL OUTPUTS
CLOCK/SYNC FROM GEN/REF BD
MOTHERBOARD
I NOISE CONTROL
SERIAL_DATA
TO CDMA GEN/REF
12
CAL
EEPROM
u_lds (L)
Q NOISE CONTROL
8
8
u_r/w (L)
uaddr 1, 15-19
6
udata 0-7
8
8
DIAG
INTERNAL
Chapter 10
SIDE
PANEL
DATA IN
DIAG LINES
DIAG
MUX
DIAG_OUT
DIAG TO
MEASUREMENT
BOARD
Block Diagrams
CDMA Generator Section
Q
Data Buffer Assembly, A2A34
304
FROM
SMB
CDMA GEN/REF
SMB
Q
Block Diagrams
Audio Generator Section
Audio Generator Section
Waveform Generation
The A2A32 Signal Source and Analyzer, see Figure 10-15 on page 306,
gets frequency and wave shape information from the Controller.
Waveform values are calculated real-time by a digital waveform
synthesis IC. The LFS1 output is always a sine-wave. The LFS2 output
is a sine-wave unless one of the function generator waveforms is
selected, or signaling is selected from the front panel.
Level Control
Audio level is controlled by the A2A44 Modulation Distribution
assembly, see Figure 10-16 on page 307, by using a DAC and variable
attenuators. The leveled audio signal is passed on to the RF Generator
section.
Chapter 10
305
Figure 10-15
SIGNAL SOURCE & ANALYZER ASSEMBLY, A2A32
GATED BUS
FROM
MEMORY SBRC
INTFC
UPC
i8051
E
P
R
O
M
RAM
LFS1
NSM
DIAG
DAC
LFS2
GLUE
LFS GND
PROCESSING
GND
GND ANALOG
-12.4
+5.1
+12.4
FILTERS
GND
DIGITAL
SIGNALING
AUDIO FROM
AUDIO ANALYZER 2
D B A GND
TRIGGER
TO
SCOPE
Block Diagrams
Audio Generator Section
DAC
12
MHz
Signal Source & Analyzer Assembly, A2A32
306
DIAG
6.78 MHz
Chapter 10
Figure 10-16
NC
NC
NC
IO
10
TO MIC ON/OFF (MIC AMPL)
NC
AUDIO MONITOR SELECT
MIC
AUDIO
INPUT
MON OUT TO
AUDIO ANALYZERS
XMTR KEY
MOD LVL1
MOD LVL0
(1, 0.1)
AC/DC
ANALOG
MODULATION
INPUT (SIDE PANEL)
LFS1 LVL1
LFS2 LVL0
PRE-EMP11
LFS1
(FROM SIGNALING
SOURCE)
+
-
FM MOD
POLARITY
(1, 0.1)
150 kHz
S.P.
AUDIO
OUT
+
DAC
S.P. GND
KEY
IN
KEY
OUT
(1, 0.1)
B
A
<1W
Z OUT
307
Block Diagrams
Audio Generator Section
-12.4
B
EN/I
D
CK
GROUP
SERIAL I/O
GNDA
AUD MON SEL
+5.1
MOD LVL
I.O.
(1, 0.01, 0)
+12.4
AC/DC
LFS1,2 LVLO.1
AUD OUT LVL
AUDIO AC/DC
AUDIO OUT
(SIDE PANEL)
LFS2 LVL1
LFS2 LVL0
AUD (1, 0.01, 0)
OUT
LVL2
GNDD
LFS
GND
(FROM SIGNALING
SOURCE)
FM MOD
TO
SIG GEN
SYNTH
NC
20 kHz
+
-
AUD
OUT
LVL1
DAC
250 kHz
LFS2
(FROM SIGNALING
SOURCE)
FM
-1
+
MIC ON/OFF
AM MOD
TO
OUTPUT
SECTION
AM
MOD SELECT
DAC
600W
DC_AM
Modulation Distribution Assembly, A2A44
Chapter 10
10
Block Diagrams
RF Generator Section
RF Generator Section
Frequency Generation
The A2A25 Signal Generator Synthesizer (Figure 10-17 on page 310)
develops a 500 MHz to 1000 MHz signal which is phase-locked to the
200 kHz reference from the A2A23 Reference Assembly (Figure 10-21
on page 315). An out-of-lock indicator LED lights if the phase-lock-loop
is out-of-lock. When you turn the Test Set’s power on, the LED lights for
a few seconds then goes out. If it stays on or comes on again, the loop is
out-of-lock.
The A2A44 Output Section assembly (Figure 10-19 on page 312)
develops the RF Generator’s 0.4 to 000 MHz frequency range by mixing,
dividing, or passing the 500 MHz to 1000 MHz from the Signal
Generator Synthesizer. The frequencies are derived as shown in Table
10-2.
The A2A110 Upconverter assembly (Figure 10-20 on page 313) develops
the RF generator’s 1.2 to 2.0 GHz range by mixing the 800-1000 MHz
signal from the output section with a 1.5-3.0 GHz LO.
Table 10-2
IF Frequencies
Output Frequency
Derivation
400 kHz - 250 MHz
mix
250 MHz - 500 MHz
divide
500 MHz - 1 GHz
pass
1.7 GHz - 2.0 GHz
mix
308
Chapter 10
Block Diagrams
RF Generator Section
Level Control
The A2A44 Output Section assembly (Figure 10-19 on page 312) has an
automatic-level-control (ALC) loop that acts as a vernier control of RF
level between −2 and +9 dBm. A step attenuator in the A2A130 RF
Input/Output assembly takes the level down to −127 dBm (−137 dBm at
the RF IN/OUT connector) in 5 dB steps.
Assemblies that affect output level calibration have factory-generated
calibration data stored in the Test Set’s EEPROM. Calibration data is
fed to digital-to-analog-converters which control level-adjustable
devices in the RF path. These assemblies are:
• A2A200 100 W-Attenuator
• A2A130 RF Input/Output
• A2A24 Output Section
• A241 DC Block
Modulation
Amplitude modulation (AM) is done on the A2A24 Output Section
assembly. The modulating signal from the A2A44 Modulation
Distribution assembly is applied to the ALC loop’s control voltage.
IQ modulation is done on the A2A120 LO IF/IQ Modulator assembly.
The IQ signal from the A2A34 Data Buffer is modulated onto the RF
signal from the A2A25 Signal Generator Synthesizer assembly.
Chapter 10
309
Figure 10-17
SIGNAL GENERATOR SYNTHESIZER ASSEMBLY, A2A25
DELAY
COMPENSATION
FILTER
OUT OF BAND FM
GAIN CTRL
8
1500MHz
14dB
OUT OF BAND
FM DAC
REF
PRESENT
DET
OUT-OFLOCK
DET
12
f IN
SWP
GAIN CONT
2
4
SDFM
INTERFACE
A-D
3
3
F(s)
3
CYCLE SLIP
OUT OF LOCK
ACFM/DCFM
I.O.
FM ON/OFF
REF PRESENT
GROUP
SERIAL I/O
EN/I
D
FROM
MEAS
12
8
CK
-12.4
A A A
GND
+12.4
P/O MOTHERBOARD A2A1
+5.1
FM MOD FROM
MOD DISTR
4V=100 kHz
DC - 25 kHz
Z OUT < 10W
+40 V
Chapter 10
FROM
REF
+43.5
D-A
SWEEP START SIG GEN
+
OUT OF BAND FM DATA
NF RUN
OUT OF BAND FM CONT
NF CONT
MOD SIGN
P10 CNTRL
FM
12
3
+- 32/33/36/37
+ NF
f OUT
SDFM
MONITOR
2
MODULUS CONT
OUT OF
LOCK
FM CONT
OUT OF BAND
FM DAC
OUT OF BAND
REF
PRESENT
CYCLE CONT
CW RF IN
Block Diagrams
RF Generator Section
0
SEC (CMOS)
Signal Generator Synthesizer Assembly, A2A25
310
5001000MHz
FROM REF
Block Diagrams
RF Generator Section
Figure 10-18
IQ Modulator Assembly (Part of LO IF/IQ Modulator Assembly),
A2A120
I/Q MODULATOR, A2A120
SMB
14 dB
SMB
RF IN
RF OUT
RF OUT
14 dB
1 GHz
SMB
Chapter 10
Q DRIVE
I-DRIVE
DRIVE
QUADRATURE
I/Q MOD
ASSEMBLY
PWR
+12 V, +12V AUX
SMB
Q IN
I IN
SMB
GEN/REF
RF IN
2
FROM
LO/IF
DATA
BUFFER
311
Figure 10-19
OUTPUT SECTION ASSEMBLY, A2A24
LPF
1 GHz BPF
LO
AMP
3 dB
PAD
AMP
IF
X
AMP
AMP
AMP
300 MHz
1 GHz ON/OFF
RF
TEMP
COMP
ALC
LOOP INTEGRATOR
2
4.5 dB
PAD
+- 2
REF DET
MOD
PERIODIC CAL
OUTPUT LVL
AM LVL
AM DIST
ALC BW
3
0
V REF.
TF TUNE
DAC
AM MODULATION
3
5
UPCNV_IN
+40V
CK
TO MEAS
EN/I
A
DIAG
1GHz LO
CARRIER
LEVEL
REF
I.O.
D
+43.5
A
MUX
GND
-12.4
7
6
A
4
+5.1
2
OPEN ACL
DRIVE
+12.4
1
0
CARRIER
LVL DAC
Chapter 10
GROUP
SERIAL I/O
P_OUT_DET_GND
(FROM
UPCONVERTER)
AM MOD
P_OUT_DET
(FROM
UPCONVERTER)
DETECT
UPCONVERTER
(NO CONNECT)
P/O MOTHERBOARD A2A1
SMB
SMC
Block Diagrams
RF Generator Section
300MHz
3 dB
3 dB
MOD
Output Section Assembly, A2A24
312
3 dB
3 dB
1
LPF
Figure 10-20
UPCONVERTER ASSEMBLY, A2A110
< 1000 MHz
J1
<+10
dBm
50
1710-1890 MHz
800-1000 MHz
UPCNV_OUT
TO RF I/O
SMC
SMA
-10
dBm
1840-2000 MHz
+8
dBm
DAC
DAC
SMB
1.5-3 GHz
AMP
J3
UPCNV_REF
(FROM REF)
.
.- 4
-2 dBm
20 MHz
O
+
f
A(S)
-
CONTROL
MEAS_CHIRP_TRIG
VOLTAGE
MUX
J2
LO-SPEED
I.O.
CAL
ROM
Upconverter Assembly, A2A110
Chapter 10
UPCNV_IN
(FROM
RF OUTPUT)
LOOP CONTROL
ASIC(S)
CONTROL
Block Diagrams
RF Generator Section
313
P_OUT_DET_GND
P_OUT_DET
+9V
+40V
-12V
+12V
+5V
EN/I
CLOCK
DATA
RIBBON
CABLE
Block Diagrams
Reference/Regulator Section
Reference/Regulator Section
Reference
All frequencies are derived from a 10 MHz reference which can come
from an external reference or from a 10 MHz crystal oscillator on the
A2A23 Reference assembly. There are two versions of the Reference
assembly. The standard Reference assembly has a temperature
compensated crystal oscillator (TCXO), and the Option 005 (High
Stability Time Base) Reference assembly has an oven controlled crystal
oscillator (OCXO). The A2A23 Reference assembly develops the local
oscillator (LO) and reference signals needed by the assemblies that
make up the RF generator, RF analyzer, spectrum analyzer, and the
A2A33 Measurement assembly.
Power Supply Regulators
Power supply regulators are distributed to all of the modules and
assemblies by he A3A1 Power Supply Regulator assembly through the
motherboard.
Power Supply
The A3A2 Power Supply assembly is a switching type supply. The
power supply generates five different dc supplies. They are:
• +5.5 Vdc
• +13.4 Vdc
• −13.4 Vdc
• +43.5 Vdc
• −12 Vdc AUX
Power Supply voltages are distributed to all of the modules and
assemblies through the motherboard.
314
Chapter 10
Figure 10-21
REFERENCE ASSEMBLY, A2A23
10MHz TCXO
2 DACS
OR
OPTIONAL OCXO
FREQ
ADJUST
1GHz
VCO
LOCK
1GHz
Reference Assembly, A2A23
Chapter 10
S
Y
N
T
H
+50
500 kHz
HPF
10MHz
OUT-OF-LOCK
OUT-OF-LOCK
10 MHz
REF IN
EXT REF
X2 FREQ
ARE < -90dBc SPURS
> 5K OFF
10M (RCVR) < -110 dBc > 5 kHz
DOUBLER
LO
1000MHz
.20M +10M REFS OUT:
1000 MHz
ON/OFF
1000 MHz ON/OFF
OVERRIDE
+2
10-20MHz
+10/
OSC
FREQ
+50
I.O.
(2 DACS
ADJUST)
LO
500MHz
DIAG
DIAG
TO
OCXO
315
Block Diagrams
Reference/Regulator Section
UPCONVERTER
REF
10MHz
OUT
(GENREF)
EN/I
TO SA
D
7dBm
MIN
CK
10MHz
PANEL
TO SIDE
20MHz
SINE
+5dBm
TO SA
TO
RCVR
SYNTH
COUNTER
P/O MOTHERBOARD A2A1
CMOS
1MHz
20MHz TO
CMOS
1MHz
TO
RCVR
SYNTH
REF
REF
SG
A
A
A
10MHz
SINE
-10dBm
TO RCVR
SSB BFO
SYN RCVR
GND
-12.4
+5.1
+12.4
10MHz
REF IN
(GENREF)
+12V
AUX
Figure 10-22
POWER SUPPLY REGULATOR ASSEMBLY, A3A1
J1 16-PIN RIBBON CONNECTOR
POWER SUPPLY INPUT/OUTPUT
J6 20-PIN MINI FIT JR. CONNECTOR
POWER SUPPLY INPUT/OUTPUT
+12 ALDC
REGULATOR
PR–158 W
2-SPEED FAN
REGULATOR
PR-0.81 W
T HI > –5° C
+5 D
REGULATOR
PR-2.94 W
+5 A
REGULATOR
PR-1.69 W
+15 V @ 315 mA
J5 16-PIN MINI FIT JR. CONNECTOR
TO MOTHER BOARD
+12 A
REGULATOR
PR-4.4 W
+12.37 V @ 1.62 A
+5.11 V @1.90 A
+5.11 V @ 3.30 A
+9.0 V 5.20 mA
–12.37 V @ 1.75 A
–13.2 V @ 450 mA
J4-3
–15 V @ 110 mA
3.0 V BATTERY
J7-2
-12 A
REGULATOR
PE-4.6 W
Block Diagrams
Reference/Regulator Section
-15 VOLT
INPUT
FILTER
Power Supply Regulator Assembly, A3A1
+6 VOLT
INPUT
FILTER
-9 VOLT
INPUT
FILTER
-15 VOLT
INPUT
FILTER
+12.37 V @ 600 mA
–5.2 V @ 650 mA
ON/OFF CNTRL
+40 V @ 44 mA
+15 V STBY @ 0.0 mA
+12.3 V STBY @ 100 mA
Chapter 10
J2 26-PIN RIBBON CONNECTOR
TO MOTHER BOARD
J3-3
3.8 A
-5 V
DC TO DC
CONVERTER
PRE-2.85 W
12V STBY
REGULATOR
PR-0.27 W
5.2 A
PWR SWITCH
ON/OFF CNTL
1.27 A
PWR
SUPPLY
ON/OFF
INPUT
FILTER
+40 VOLT
INPUT
FILTER
84 mA
2.4 A
316
+15V STBY
INPUT
FILTER
110mA
Block Diagrams
Instrument Control Section
Instrument Control Section
Digital Control
The Test Set’s Digital Control is driven by two assemblies:
• A2A30 Memory/SBRC
• A2A31 Controller
The controller receives user control information by either the A2A70
Control Interface or by the front panel. Operating firmware on the
A2A30 Memory/SBRC is then used by the A2A31 Controller to generate
digital control for the Test Set. The digital control bus information is
passed back to the A2A30 Memory/SBRC which controls most of the
Test Set’s modules and assemblies.
Display
The Test Set’s Display data is first generated by the A7 Controller and
then passed on to the A20 CRT drive. The A20 CRT drive converts the
digital information into analog vertical and horizontal drive signals for
the A22 CRT display. The A20 CRT drive also provides brightness and
contrast signals for the A22 CRT display.
Chapter 10
317
RAM
DAUGHTER
BD
E6380-20114
71285
DECODER
DIVIDER
MSC_REG
LITHUM
BATTERY
CR2477
BUS
TRANSCEMERS
ACE
TL16PIR552
FROM
MEAS BD
SBRC_BUS
TO RF
MODULES
BATTERY
MANAGER
USER_BTTY
CLOCK
22.1184
MHz
KYBD_RPG_BUS
MEAS_SBRC
TO
REGULATOR
BOARD
TO
KEYBOARD
CRT_MEAS_BUS
GATED_BUS
INTERRUPTS
CPU_BUS
TO MEAS BOARD
TO SIG SOURCE
TO MEAS BOARD
RESET
TO MEAS BOARD
COMPOSITE VIDEO
DISPLAY
DRIVER
GSP
TMS34010
40 MHz
BIT SYNC
16V8 &
EMP7032
Chapter 10
VIDEO DRAM
OKI M514262
PLANER
EL DISPLAY
TO VIDEO OUT
(SIDE PANEL)
Block Diagrams
Instrument Control Section
REAL
TIME
CLOCK
72423
Memory/SBRC Assembly, A2A30
318
NONVOLATILE
RAM
TC551001
1 MB
Figure 10-23
MEMORY/SBRC ASSEMBLY, A2A30
Figure 10-24
CONTROLLER ASSEMBLY, A2A31
HW LEADS
RST ERR
DONE
CLOCK
CLOCK &
DIVIDER
40MHz
CPU
MC68020
20MHz
HEAP RAM
TC551001
1MB
DIAG
LEADS
CRT_MEAS_BUS
CTRL_IFACE_BUS
GATED_BUS
KYBD_RPG_BUS
INTERRUPTS
CPU_BUS
RESET
Controller Assembly, A2A31
Chapter 10
BUS BARN FPGA
XC5210
MSC_REGS IRQ_MGR BUS_MUX
KYPD/RPG_FSM GATED_BUS
OFF_BD_DSACK BUS_DECODER
SWISS ARMY KNIFE
EPM71285
MORE CLOCKS
DECODER DSACK
RESET BERR
SUPPLY
VOLTAGE
SUPERVISOR
MAX700
FW FLASH
ROM
28F-016
8MB
FPU
MC68882
20MHz
TRIPLE
TIME
68840
BOOT
ROM
27PCO10
128 KB
CONFIG
ROM
27PCO10
128 KB
CAL FLASH
ROM
28F0018XB
128 KB
KYBD_RPG_BUS
CRT_MEAS_BUS
GATED_BUS
INTERRUPTS
CPU_BUS
RESET
PCMCIA
GLUE
EPM7128S
CTRL_IFACE_BUS
CPU_BUS
CONTROL
INTERFACE
HP-IB
T199C14
ACE
TL16PIR552
ACE
TL16PIR552
PARALLEL_16
SERIAL_14
SERIAL_11
PARALLEL_15
SERIAL_10
SERIAL_9
HP-IB
319
Block Diagrams
Instrument Control Section
PCMCIA
CONTROLLER
Block Diagrams
Instrument Control Section
320
Chapter 10
A
Error Messages
321
Error Messages
General Information About Error Messages
General Information About Error Messages
Several types of messages may be displayed on the Test Set’s screen.
Error messages usually appear at the top of the start-up or default
screen as shown in Figure A-1.
Figure A-1
Error Message Location
One or more self tests failed. Error code: 0080
CDMA ANALYZER
Avg Pwr
RF Channel
25
N AMER PCS
dBm
Pwr Zero
Zero
ADC FS
Pwr Intvl
Analyzer
5.00
ms
Auto Zero
Auto/Manual
Pwr Gain
Auto/Hold
66 dB
PN Offset
Arm Meas
Single/Cont
Disarm
Qual Event
80 ms
Trig Event
0.00
Input Port
RF In ONLY
dB
Immed
Even Sec In
Enable/Not
Anl Special
Normal
errmsg1.eps
Error messages descriptions can be found in the following manuals:
• Agilent 8935A Reference Guide
• Agilent 8935A Assembly Level Repair Manual (this manual)
• Agilent Instrument BASIC User’s Handbook (Agilent P/N
E2083-90005)
The type of message determines which manual to refer to for more
information. There are four types of messages:
• Positive numbered error messages
• IBASIC error messages
• GPIB error messages
• Text only messages
322
Appendix A
Error Messages
General Information About Error Messages
The following paragraphs give a brief description of each message
format and direct you to the manual to look in for information about
error messages displayed in that format.
NOTE
BEEPER OPERATION: Messages are always accompanied by a BEEP
from the internal speaker, unless the Beeper field on the
INSTRUMENT CONFIGURE screen is set to Off.
CAUTION
IF YOU HEAR A LOUD SIREN OR WARBLING SOUND, THIS IS
THE OVER POWER WARNING!
Remove any connections to the side panel RF IN/OUT, DUPLEX OUT,
and ANTENNA IN connectors. NEVER turn off the Test Set while RF
power is being applied to these connectors. After RF power is removed,
turn the Test Set off and then back on. The Test Set should power up in
its factory preset state (unless a POWERON Save/Recall register was
saved). The siren should not come back on.
Appendix A
323
Error Messages
Power-Up Self-Test Error Messages
Power-Up Self-Test Error Messages
The following message is typical of an error message you might
encounter on the Test Set’s power-up.
One or more self tests failed. Error code: 0080
In this example, the hexadecimal code 0080 corresponds to the error
message “Keyboard Failure (stuck key).” For examples of other
power-up error messages, see “Reading Front Panel or GPIB Codes” on
page 54.
324
Appendix A
Error Messages
Diagnostics Messages
Diagnostics Messages
The following message may occur when initiating and running the
Functional Diagnostics program.
Direct latch write occurred. Cycle power when done
servicing.
For other diagnostic messages see “Frequently Encountered Diagnostic
Messages” on page 73.
When a measurement is out of limits, a message is displayed at the end
of the test which indicates the following:
• Suspected faulty assembly.
• Confidence level of the assertion: low, medium, or high
• Failure code
For a description of the test, including an interpretation of the failure
codes, see Chapter 3 , “Troubleshooting,” on page 47.
Appendix A
325
Error Messages
Calibration Download Failure Error Message
Calibration Download Failure Error Message
The following message occurs at powerup when the downloading of
calibration data is unsuccessful.
Cal file checksum incorrect. File reset to default values.
It indicates that the calibration data is corrupt, and although the Test
Set will function, measurements will be inaccurate. Calibration data is
downloaded from a memory card when certain assemblies are replaced,
or it is generated when the Periodic Calibration program is run. This
message will not occur again at powerup unless another unsuccessful
downloading occurs.
326
Appendix A
Error Messages
Flash ROM Firmware Upgrade Error Messages
Flash ROM Firmware Upgrade Error Messages
Test Set’s firmware is stored in flash ROMs. With flash ROMs, the
firmware can be quickly upgraded with new firmware from a memory
card. It is not necessary to open the Test Set and replace individual ICs.
Should problems arise in the process of uploading the new firmware,
the user is notified by messages on the display which state the situation
and suggest any actions to be taken.
The firmware upgrade process begins when the user inserts the
firmware upgrade memory card into the front-panel memory card
socket and turns the Test Set on. The Test Set notes the presence of a
valid firmware upgrade card and proceeds to upload the firmware on
the memory card into the flash ROMs on the A2A31 Controller
assembly. Any failures that occur during the upload process are
immediately reported and the upload is aborted.
The error messages that may be displayed during a firmware upgrade
are listed in alphabetical order in the following paragraphs.
Supplemental fault information is included.
Memory Card Checksum Error
The memory card may be at fault. The card reader on the Memory
board could also be faulty.
Memory Card Read Error
This error will always appear if the user removes the memory card
during the upload process. The memory card itself could be faulty or,
less likely, the card reader on the Memory board.
Memory Erase Error
This fault is most likely caused by either the flash ROMs themselves or
the controller circuits. In either case replace the A2A31 Controller
assembly.
Memory Write Error
This fault is most likely caused by either the flash ROMs themselves or
the controller circuits. In either case replace the A2A31 Controller
assembly.
Appendix A
327
Error Messages
Flash ROM Firmware Upgrade Error Messages
Programming Voltage Error
The programming voltage is supplied to the flash ROMs from the power
supply through the Controller assembly. The fault is most likely on the
Controller but can be caused by the Filter/Regulator assembly.
ROM Checksum Error
With the new firmware loaded into the Test Set’s flash ROMs, the
checksum on the ROM is tested. A faulty checksum is most likely
caused by the flash ROMs themselves or possibly the controller circuits.
In either case replace the A2A31 Controller assembly.
328
Appendix A
Error Messages
Self-Calibration Error Messages
Self-Calibration Error Messages
Voltmeter Self Calibration Failed. Error = 223, 0x0000ffff
(EXAMPLE)
The example noted above is one of many messages that may occur
during self-calibration. When the Test Set is powered up and at timed
intervals for certain measurements, the Test Set calibrates itself
internally. Calibration usually takes 20 to 30 ms. The following
measurements are calibrated at these timed intervals:
• Voltmeter: approximately every 3 minutes
• Counter: approximately every 3 minutes
• Oscilloscope: approximately every 3 minutes
• Spectrum Analyzer: approximately every 4 minutes
Should a self-calibration fail, an error message is displayed. The error
code (223, 0x0000ffff in the example above) will vary depending on the
particular failure. Failures of this type are generally caused by
hardware. Since a general self-calibration occurs immediately after
power-up, these failures often appear as though they are power-up
self-test errors.
When a self-calibration failure occurs, check the A2A33 Measurement
assembly first since most of the measurement circuitry described above
is located on it. However, in the case of the spectrum analyzer
calibration, check the A2A20 Spectrum Analyzer assembly first. The
A2A23 Reference assembly may also cause its own self-calibration
failure or a Spectrum Analyzer error message. (The error message in
the example above can be generated by unplugging the A2A23
Reference before powering up the Test Set.)
After displaying a self-calibration error message, the Test Set will
proceed with the measurement using default calibration factors.
Depending on the nature of the failure, subsequent measurements may
look normal. The error message will persist.
Appendix A
329
Error Messages
Text Only Error Messages
Text Only Error Messages
Text only error messages are generally associated with manual
operation of the Test Set. Text only error messages can also be
displayed while running the Test Set’s built-in diagnostic or calibration
utility programs. Diagnostic messages are described in "Frequently
Encountered Diagnostic Messages" on page 73.
Text only error messages take the form:
This is an error message.
For example:
• Input value out of range - occurs when trying to set a value
above or below its capability (such as attempting to set the RF Gen
Freq field to 2 GHz).
• Turn off either AM or FM setting - occurs when trying to
perform simultaneous AM and FM modulation.
330
Appendix A
Error Messages
Positive Numbered Error Messages
Positive Numbered Error Messages
Positive numbered error messages usually occur when trying to save or
retrieve an IBASIC file, or when trying to run a faulty IBASIC
program. Refer to the Agilent Instrument BASIC User’s Handbook for
information on IBASIC error messages.
Positive numbered error messages take the form:
ERROR XX “error message”
For example:
• Error 54 Duplicate file name - occurs when trying to save a file
to a device where a file with the same name already exists.
• Error 5 Improper Context Terminator - occurs when an END,
SUBEND, or FNEND statement is not present in the program when
required.
Appendix A
331
Error Messages
IBASIC Error Messages
IBASIC Error Messages
IBASIC Error Messages are associated with IBASIC language
operation. IBASIC error messages can have both positive and negative
numbers (but always start with "IBASIC Error:"). Refer to the Agilent
Instrument BASIC User’s Handbook for information on positive
numbered error messages. Refer to the GPIB Error Messages section of
the Agilent 8935 Reference Guide for information on negative numbered
error messages (the error message associated with a negative number is
the same for GPIB errors and IBASIC errors).
IBASIC error messages take the form:
IBASIC Error: -XX error message
For example:
IBASIC Error: -286 Program runtime error
332
Appendix A
Error Messages
GPIB Error Messages
GPIB Error Messages
GPIB Error Messages are associated with GPIB operation. Refer to the
Agilent 8935 Syntax Reference Guide for information on GPIB error
messages.
NOTE
HP-IB and GPIB are used interchangably throughout this manual and
all E6380A documentation.
GPIB error messages take the form:
HP-IB Error: -XX error message
or
HP-IB Error error message
For example:
HP-IB Error: -410 Query INTERRUPTED.
or
HP-IB Error: Input value out of range.
Appendix A
333
Error Messages
Non-Recoverable Firmware Error
Non-Recoverable Firmware Error
This error occurs when the Test Set encounters a condition that the
firmware doesn’t understand - causing the Test Set to halt operation
until power is cycled. The message appears in the center of the Test
Set’s display and (except for the two lines in the second paragraph) has
the form:
Non-recoverable firmware error.
ftext below and contact Agilent
your local service center or by
(USA, toll-free)ask to speak to
Please record the 2 lines o
Technologies through
calling 1-800-827-3848
the 8935 Service Engineer.
‘Address error exception’
at line number 0
Follow the instructions in the message.
Unfortunately, you cannot recover from this condition without turning
the Test Set off. The error may not reoccur when you turn the Test Set
back on and rerun the test where the error message first occurred. If
the failure reoccurs, you should record exactly what the configuration of
the instrument was when the error appeared, and contact Agilent. This
information will help us determine the proper course of action for your
repair.
If This Error Occurs at Power-Up
If the Test Set displays this error when first powered up, disabling Test
Set operation, it could be related to the Autostart field on the main
TESTS screen. This field causes the Test Set to automatically run the
last program loaded in memory when the Test Set is powered up. If the
program is corrupted, the Test Set will automatically “lock up.”
The only way to recover from this condition is to clear the Test Set’s
operating RAM. This will clear any IBASIC program, Save/Recall
registers, and RAM disks that have been saved, as well as three
calibration factors. The calibration factors are easily re-entered; the
IBASIC programs, Save/Recall registers, and RAM disks must be
re-loaded or re-initialized after clearing memory.
To clear the Test Set’s RAM:
1. Turn the Test Set off.
2. Hold the Code Dom and HZ/ µV keys down.
3. Turn the power on (with the buttons still held down) and wait until
the initial power-up screen is displayed.
334
Appendix A
Error Messages
Non-Recoverable Firmware Error
Use the following procedure to re-enter the three calibration factors
that were erased when RAM is cleared. Use the GENERATOR
ANALYZER screen keys (to the left of the cursor control knob) to access
the required screens.
1. Access the RF GENERATOR screen and select DC FM Zero (under
the FM Coupling field).
2. Disconnect any cables from the ANT IN or RF IN/OUT connectors.
3. Access the RF ANALYZER screen and select Zero under the TX Pwr
Zero field.
4. Access the AF ANALYZER screen and select Zero under the
DC Current field.
Appendix A
335
Error Messages
Non-Recoverable Firmware Error
336
Appendix A
Index
Numerics
6 kHz BPF. See Audio Filters
(A2A80A1, A2A80A2)
A
A1. See Front Panel assembly (A1)
A1A1. See Display assembly
(A1A1)
A1A2. See Keypad assembly
(A1A2)
A1A3. See RPG assembly (A1A3)
A2. See PC Board assemblies (A2)
A2A1. See Motherboard assembly
(A2A1)
A2A10. See PCMCIA assembly
(A2A10)
A2A100. See Gen Ref assembly
(A2A100)
A2A110. See Upconverter
assembly (A2A110)
A2A115. See Downconverter
assembly (A2A115)
A2A120. See LO IF/IQ Mod
assembly (A2A120)
A2A130. See RF I/O assembly
(A2A130)
A2A20. See Spectrum Analyzer
assembly (A2A20)
A2A200. See Attenuator assembly
(A2A200)
A2A21. See Receiver assembly
(A2A21)
A2A23. See Rcvr Synth assembly
(A2A23)
A2A24. See RF Output assembly
(A2A24)
A2A25. See Sig Gen Synth
assembly (A2A25)
A2A30. See Memory/SBRC
assembly (A2A30)
A2A31. See Controller assembly
(A2A31)
A2A32. See Signal Source
assembly (A2A32)
A2A33. See Measurement
assembly (A2A33)
A2A34. See Data Buffer assembly
(A2A34)
A2A36. See Receiver DSP
assembly (A2A36)
A2A40. See Audio 2 assembly
(A2A40)
A2A44. See Mod Distribution
assembly (A2A44)
A2A50. See Display Driver
assembly (A2A50)
Index
A2A70. See Control Interface
assembly (A2A70)
A2A80. See Audio 1 assembly
(A2A80)
A2A80A1, A2A80A2. See Audio
Filters (A2A80A1, A2A80A2)
A3. See Rear Panel assembly (A3)
A3A1. See Regulator assembly
(A3A1)
A3A2. See Power Supply assembly
(A3A2)
A3A3. See Line Module assembly
(A3A3)
A3A4. See Battery Holder
assembly (A3A4)
A3B1. See Fan assembly (A3B1)
A3S1. See Power Switch assembly
(A3S1)
AA battery replacement, 97
AC Level Accuracy (AF Analyzer)
performance test, 201
AC Level Accuracy (AF
Generator) performance test,
197
adjustments. See periodic
adjustments
AF Diagnostics. See diagnostics
air filter, cleaning, 97
Amplitude Accuracy
(Oscilloscope) performance
test, 208
Amplitude Level Accuracy
(CDMA Generator)
performance test, 221
assembly descriptions, 38
Attenuator assembly (A2A200)
disassembly, 122
parts identification, 142
Audio 1 assembly (A2A80)
block diagram, 295
disassembly, 115
parts identification, 141
Audio 2 assembly (A2A40)
block diagram, 296
parts identification, 140
Audio Analyzer 1 Offset
adjustment, 168
Audio Filters (A2A80A1,
A2A80A2)
disassembly, 115
parts identification, 141
Audio Frequency Generator Gain
adjustment, 167
Average Power Level Accuracy
(CDMA Analyzer)
performance test, 225
B
battery
AA battery, 97
PC card, 99
Battery Holder assembly (A3A4)
disassembly, 129
parts identification, 147
black button, reset, 98
block diagrams
Audio 1 assembly (A2A80), 295
Audio 2 assembly (A2A40), 296
Controller assembly (A2A30),
319
Data Buffer assembly (A2A34),
304
Downconverter assembly
(A2A115), 290
Gen Ref assembly (A2A100),
303
IQ modulator, 311
LO IF/IQ assembly (A2A120),
300, 311
Measurement assembly
(A2A33), 297
Memory/SBRC assembly
(A2A30), 318
Mod Distribution assembly
(A2A44), 307
overall, 39, 285
Rcvr Synth assembly (A2A22),
291
Receive DSP assembly (A2A36),
301
Receiver assembly (A2A22), 292
Reference assembly (A2A23),
315
reference section (simplified), 79
Regulator assembly (A3A1), 316
RF I/0 assembly (A2A130), 287
RF Output assembly (A2A24),
312
Sig Gen Synth assembly
(A2A25), 310
Signal Source assembly
(A2A32), 298, 306
Spectrum Analyzer assembly
(A2A20), 293
Upconverter assembly
(A2A110), 313
C
cables
connection information, 130
hardware for, 148
part numbers, 130
parts identification, 148, 149
power, 23
337
Index
calibration. See periodic
adjustments
calibration data
how to recover, 81, 158
loss of, 81, 158
storage locations, 159
troubleshooting, 81, 158
calibration factors, 162
calibration, internal, 329
carrier feedthrough, minimizing,
170
CDMA Diagnostics. See
diagnostics
Channel Power Level Accuracy
(CDMA Analyzer)
performance test, 227
cleaning
air filter, 95
assemblies, 95
clearing RAM, 89
clock, real-time, 95
C-MESS FLTR. See Audio Filters
(A2A80A1, A2A80A2)
codes. See failure codes
Control Interface assembly
(A2A70)
disassembly, 117
parts identification, 143
Controller assembly (A2A31)
block diagram, 319
parts identification, 141
Counter Connection field,
SERVICE screen, 87
covers
parts identification, 138
D
DACs
IQ, 170
settings, 88
timebase reference, 169
Data Buffer assembly (A2A34)
block diagram, 304
parts identification, 141
DC Level Accuracy (AF Analyzer)
performance test, 204
DC Level Accuracy (AF
Generator) performance test,
198
description
assemblies, 38
diagnostic error messages, 73
diagnostic self-test LED codes, 56
diagnostics
AF Diagnostics
accessing, 68
All Audio Tests, 68
338
Audio Analyzer 1 External
Paths, 68
Audio Analyzer 1 Internal
Paths, 68
Audio Analyzer 2, 68
Audio Frequency Generators 1
and 2, 68
Down Converter, 70
Mod Distribution External
Paths, 68
Mod Distribution Internal
Paths, 68
Preliminary Audio Path, 68
Spectrum Analyzer, 70
CDMA Diagnostics
accessing, 72
Functional Diagnostics
accessing, 62
Analog Modulation, 67
CDMA Loopback, 67
Power Supplies, 67
RF Modules, 67
Self-Test, 67
RF Diagnostics
accessing, 70
All RF Tests, 70
Output, 70
Receiver, 70
Receiver Synthesizer, 70
Reference, 70
RF Input/Output, 70
Signal Generator Synthesizer,
70
Upconverter, 70
disassembly
Attenuator assembly (A2A200),
122
Audio 1 assembly (A2A80), 115
Audio Filters (A2A80A1,
A2A80A2), 115
Batter Holder assembly (A3A4),
129
Control Interface assembly
(A2A70), 117
Display assembly (A1A1), 110
Downconverter assembly
(A2A115), 118
external covers, 104
Fan assembly (A3B1), 129
Front Panel assembly (A1), 110
Gen Ref assembly (A2A100),
120
internal bottom cover, 108
internal covers, 105
Keypad assembly (A1A2), 110
Line Module assembly (A3A3),
129
LO IF/IQ Mod assembly
(A2A120), 120
Motherboard assembly (A2A1),
124
PC Board assemblies (A2), 112
PCMCIA assembly (A2A10),
116
Power Supply assembly (A3A2),
127
Rear Panel assembly (A3), 126
Regulator assembly (A3A1), 127
RF I/0 assembly (A2A130), 118
RPG assembly (A1A3), 110
Upconverter assembly
(A2A110), 118
Display assembly (A1A1)
disassembly, 110
parts identification, 139
Display Driver assembly (A2A50)
parts identification, 140
Distortion (AF Analyzer)
performance test, 203
Downconverter assembly
(A2A115)
block diagram, 290
disassembly, 118
parts identification, 144
E
Eb/No Calibration adjustment
description, 171
selecting and running, 163
e-mail, factory address, 46
equipment
for performance tests, 174
for System Power Calibration
program, 161
overview for adjustments, 160
error codes. See failure codes
error messages
"Autostart Test Procedure in
Power-Up", 51
"Cal file checksum incorrect...",
326
"Change Ref Level, Input Port or
Attenuator...", 73
"Direct latch write occurred...",
73, 325
"ERROR 173 IN XXXX
Active/system...", 73
"HP-IB Error:...", 333
"IBASIC Error...", 332
"Non-recoverable firmware
error...", 334
"One or more self tests failed...",
324
"Printer does not respond", 73
Index
Index
"Voltmeter Self Calibration
Failed...", 329
diagnostic, 73
general information, 322
memory card checksum error,
327
memory card erase error, 327
memory card read error, 327
memory write error, 327
numbered, 331
programming voltage error, 328
ROM checksum error, 328
timeouts, 74
types, 322
EVM, 229
External Modulation Path Gain
adjustment, 168
F
factory support
e-mail, 46
internet (Agilent personnel
only), 46
phone number, 46
failure codes
diagnostic (displayed), 54
diagnostic (returned over
HP-IB), 54
See Also LEDs
failure on power-up, 52
failures
power up, 50
self-test, 50
Fan assembly (A3B1)
disassembly, 129
parts identification, 147
firmware
checking version, 42
loading DSP firmware, 41
loading host firmware, 40
non-recoverable error, 334
upgrade kits, 40
flowchart, troubleshooting, 49
FM Accuracy (RF Analyzer)
performance test, 211
FM Accuracy (RF Generator)
performance test, 181
FM Bandwidth (RF Analyzer)
performance test, 215
FM Distortion (RF Analyzer)
performance test, 213
FM Distortion (RF Generator)
performance test, 178
FM Flatness (RF Generator)
performance test, 184
Index
Frequency Accuracy (AF
Generator) performance test,
200
Frequency Accuracy to 100 kHz
(AF Analyzer) performance
test, 205
Frequency Accuracy to 400 kHz
(AF Analyzer) performance
test, 206
Front Panel assembly (A1)
disassembly, 110
parts identification, 139
Functional Diagnostics. See
diagnostics
fuse, 52
G
Gate Time field, SERVICE screen,
87
Gen Ref assembly (A2A100)
block diagram, 303
disassembly, 120
parts identification, 145
troubleshooting, 78
GFI (ground fault interrupter)
test button, 98
H
Harmonics Spectral Purity (RF
Generator) performance test,
195
I
IF frequencies, 288
Image Rejection (Spectrum
Analyzer) performance test,
219
internet, factory website (Agilent
personnel only), 46
IQ Calibration adjustment
description, 170
selecting and running, 163
IQ modulator
block diagram, 311
K
Keypad assembly (A1A2)
disassembly, 110
parts identification, 139
L
Latch field, SERVICE screen, 88
latches
DAC, 88
gain, 88
switch, 88
timebase, 169
LEDs
diagnostic codes, 56
failure codes, 50
out-of-lock indicators, 78
power supply, 52
Level Accuracy (RF Analyzer)
performance test, 210
Level Accuracy (RF Generator)
performance test, 190
Line Module assembly (A3A3)
disassembly, 129
parts identification, 147
LO IF/IQ Mod assembly (A2A120)
block diagram, 300, 311
disassembly, 120
parts identification, 145
M
maintenance. See preventative
maintenance
manuals, 33, 45
Measurement assembly (A2A33)
block diagram, 297
parts identification, 140
memory backup battery (rear
panel), 97
memory card. See PC card
Memory/SBRC assembly (A2A30)
block diagram, 318
parts identification, 141
Mod Distribution assembly
(A2A44)
block diagram, 307
parts identification, 140
Modulation Accuracy (CDMA
Analyzer) performance test,
229
Modulation Accuracy (CDMA
Generator) performance test,
223
module swap. See troubleshooting,
assembly swap
Motherboard assembly (A2A1)
disassembly, 124
parts identification, 146
N
non-recoverable firmware error,
334
O
ordering parts, 46
339
Index
P
parts
ordering information, 46
parts identification
Attenuator assembly (A2A200),
142
Audio 1 assembly (A2A80), 141
Audio 2 assembly (A2A40), 140
Audio Filters (A2A80A1,
A2A80A2), 141
Batter Holder assembly (A3A4),
147
cables, 148, 149
Control Interface assembly
(A2A70), 143
Controller assembly (A2A31),
141
covers, 138
Data Buffer assembly (A2A34),
141
Display assembly (A1A1), 139
Display Driver assembly
(A2A50), 140
Downconverter assembly
(A2A115), 144
Fan assembly (A3B1), 147
Front Panel assembly (A1), 139
Gen Ref assembly (A2A100),
145
Keypad assembly (A1A2), 139
Line Module assembly (A3A3),
147
LO IF/IQ Mod assembly
(A2A120), 145
Measurement assembly
(A2A33), 140
Memory/SBRC assembly
(A2A30), 141
Mod Distribution assembly
(A2A44), 140
Motherboard assembly (A2A1),
146
PC Board assemblies (A2), 140
PCMCIA assembly (A2A10),
142
Power Supply assembly (A3A2),
147
Power Switch assembly (A3S1),
147
Rcvr Synth assembly (A2A23),
140
Rear Panel assembly (A3), 147
Receiver assembly (A2A21), 140
Receiver DSP assembly
(A2A36), 141
Regulator assembly (A3A1), 147
RF I/O assembly (A2A130), 144
340
RF Output assembly (A2A24),
140
RPG assembly (A1A3), 139
Sig Gen Synth assembly
(A2A25), 140
Signal Source assembly
(A2A32), 140
Spectrum Analyzer assembly
(A2A20), 140
subframe (for Motherboard),
146
Upconverter assembly
(A2A110), 144
parts list, 150
PC Board assemblies (A2)
disassembly, 112
parts identification, 140
PC card battery, 99
PCMCIA assembly (A2A10)
disassembly, 116
parts identification, 142
PCMCIA card. See PC card
performance test record, 233–281
performance tests
AC Level Accuracy (AF
Analyzer), 201
AC Level Accuracy (AF
Generator), 197
Amplitude Accuracy
(Oscilloscope), 208
Amplitude Level Accuracy
(CDMA Generator), 221
Average Power Level Accuracy
(CDMA Analyzer), 225
Channel Power Level Accuracy
(CDMA Analyzer), 227
DC Level Accuracy (AF
Analyzer), 204
DC Level Accuracy (AF
Generator), 198
Distortion (AF Analyzer), 203
equipment required, 174
FM Accuracy (RF Analyzer),
211
FM Accuracy (RF Generator),
181
FM Bandwidth (RF Analyzer),
215
FM Distortion (RF Analyzer),
213
FM Distortion (RF Generator),
178
FM Flatness (RF Generator),
184
Frequency Accuracy (AF
Generator), 200
Frequency Accuracy to 100 kHz
(AF Analyzer), 205
Frequency Accuracy to 400 kHz
(AF Analyzer), 206
Harmonics Spectral Purity (RF
Generator), 195
how to use, 174
Image Rejection (Spectrum
Analyzer), 219
Level Accuracy (RF Analyzer),
210
Level Accuracy (RF Generator),
190
Modulation Accuracy (CDMA
Analyzer), 229
Modulation Accuracy (CDMA
Generator), 223
Residual Distortion (AF
Generator), 199
Residual FM (RF Analyzer), 217
Residual FM (RF Generator),
187
Residual Noise (AF Analyzer),
202
SINAD Accuracy (AF Analyzer),
203
Spurious Spectral Purity (RF
Generator), 196
periodic adjustments
accessing, 160
Audio Analyzer 1 Offset, 168
Audio Frequency Generator
Gain, 167
Eb/No Calibration, 171
External Modulation Path Gain,
168
IQ Calibration, 170
location of voltmeter
connections, 166
schedule, 94
selecting and running, 163
system power calibration
program (SYSPWR0), 164
Timebase Reference Using a
Counter, 165
Timebase Reference Using a
Source, 166
Variable Frequency Notch
Filter, 168
Voltmeter References, 166
Periodic Calibration. See Also
periodic adjustments
periodic calibration. See periodic
adjustments
phone number
Agilent support, 46
parts ordering, 46
Index
Index
power cables, 23
power supply
LEDs, 52
test points, 53
Power Supply assembly (A3A2)
disassembly, 127
parts identification, 147
power supply regulator. See
Regulator assembly (A3A1)
Power Switch assembly (A3S1)
parts identification, 147
power-up diagnostics, 50
power-up failures, 52
preventative maintenance
cleaning, 95
cleaning air filter, 97
functionality tests after repair
or calibration, 95
memory backup battery, 97
physical integrity, 96
procedures, 97
printer setup, 64
R
RAM
back up battery (rear panel), 97
RAM Initialize field, SERVICE
screen, 89
RAM, cleaning, 89
Rcvr Synth assembly (A2A22)
block diagram, 291
parts identification, 140
troubleshooting, 80
Rear Panel assembly (A3)
disassembly, 126
parts identification, 147
Receive DSP assembly (A2A36)
block diagram, 301
parts identification, 141
Receiver assembly (A2A21)
block diagram, 292
parts identification, 140
red button, GFI test, 98
REFERENCE (A2A23)
troubleshooting, 80
Reference assembly (A2A23)
block diagram, 315
Regulator assembly (A3A1)
block diagram, 316
disassembly, 127
parts identification, 147
repair process, 44
replacement parts, 136–150
reset button, 98
Residual Distortion (AF
Generator) performance test,
199
Index
Residual FM (RF Analyzer)
performance test, 217
Residual FM (RF Generator)
performance test, 187
Residual Noise (AF Analyzer)
performance test, 202
RF analyzer section
troubleshooting, 82
RF Diagnostics. See diagnostics
RF Generator Spurious Spectral
Purity performance test, 196
RF I/0 assembly (A2A130)
block diagram, 287
RF I/O assembly (A2A130)
disassembly, 118
parts identification, 144
RF Output assembly (A2A24)
block diagram, 312
parts identification, 140
RF source section
troubleshooting, 84
rho, 229
RPG assembly (A1A3)
disassembly, 110
parts identification, 139
rx_dsp_version, 42
S
safety warnings and cautions, 14
save/recall register, 51
self-calibration, 329
self-test diagnostics, 50
self-test failures, 50
SERVICE screen
accessing, 86
Counter Connection field, 87
Gate Time field, 87
Latch field, 88
RAM Initialize field, 89
rx_dsp_revision, 42
Value (hex) field, 89
Voltmeter Connection field, 87
SERVICE4
diagnostics
loading, 62
menu, 65
See Also diagnostics
Eb/No Calibration
accessing, 163
loading, 163
IQ Calibration
accessing, 163
loading, 163
Periodic Calibration
accessing, 163
loading, 163
Sig Gen Synth assembly (A2A25)
block diagram, 310
parts identification, 140
troubleshooting, 80
Signal Source assembly (A2A32)
block diagram, 298, 306
parts identification, 140
SINAD accuracy (AF Analyzer)
performance test, 203
siren, overpower condition, 323
smart card. See PC card
Spectral Purity (harmonics)
performance test, 195
Spectral Purity (spurious)
performance test, 196
Spectrum Analyzer assembly
(A2A20)
block diagram, 293
parts identification, 140
swapping assemblies, 81
SYSPWR0 program
accessing, 164
loading, 164
T
technical support, 46
test points
power supply, 53
voltmeter reference, 167
test record, 233–281
theory of operation
audio analyzer, 294
audio generator, 305
CDMA analyzer, 299
CDMA generator, 302
digital control, 317
display, 317
oscilloscope, 294
power supply, 314
reference, 314
RF analyzer, 288
RF generator, 308
spectrum analyzer, 288
timebase DACs, 169
Timebase Reference Using a
Counter adjustment, 165
Timebase Reference Using a
Source adjustment, 166
timeouts, 74
tools
required for disassembly, 102
torque settings, 102
See Also equipment
torque requirements, 102
troubleshooting
assembly swap, 81
calibration data, 81
flow chart, 49
341
Index
Gen Ref assembly (A2A100), 78
manual procedures, 75
Rcvr Synth (A2A22), 80
Reference (A2A23), 80
RF analyzer, 82
RF source section, 84
Sig Gen Synth (A2A25), 80
U
Upconverter assembly (A2A110)
block diagram, 313
disassembly, 118
parts identification, 144
upgrades
firmware, 40
V
Value (hex) field, SERVICE
screen, 89
Variable Frequency Notch Filter
adjustment, 168
verification
after repair, 90
See Also performance tests
video output signal, 53
Voltmeter Connection field,
SERVICE screen, 87
Voltmeter References adjustment,
166
342
Index
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