GladiATR Vision – Diamond ATR with Sample View

GladiATR Vision – Diamond ATR with Sample View
FTIR, NIR and UV-Vis
Accessories and
Supplies
C omprehensive
C atalog of
S pectroscopy
S ampling
S olutions
2017 Vol.1
www.piketech.com
W ho W e A re
PIKE Technologies was established in 1989 by Phil and
Irene Brierley with the goal of creating a unique enterprise
specializing in the imaginative design and creation of highquality custom spectroscopic accessories. They founded PIKE
on the principle of making the life of the spectroscopist easier
through replacing traditional, tedious sampling routines with
a range of innovative products and techniques...and all at an
outstanding value!
Phil’s knowledge of optics, mechanics, and software along
with his honesty and dedication earned him great respect. His
fun-loving nature, thoughtfulness and loyalty made him
many friends. He influenced the FTIR industry with highvalue accessories. Under his leadership, PIKE created a
comprehensive line of sampling accessories including Attenuated Total Reflectance (ATR), diffuse and
specular reflectance, transmission cells, sample
holders and automation. Phil passed away in
1999, but his legacy lives on.
After 27 years, PIKE is proud to carry on
Phil’s vision and ideals. We are always looking for new ways to help make your spectroscopy
sampling easier and more effective. We think you will
see in our new products introduced each year that you, our
customers, have helped us to achieve this goal.
If you do not see what you need in this catalog, please contact us. Your
input may become one of our product offerings in the future. We look forward to
serving you with our products and support.
A unique enterprise specializing in the imaginative design
and creation of excellent spectroscopic accessories,
providing high-quality solutions to all customers.
Helpful Links
Order Form
Quote Request Form
International Sales Offices
FTIR Instrument Codes
UV-Vis Instrument Codes
Application Notes
Visit our Website
Contact Us
Table Of Contents
Sampling Kits – A Great Place to Start
Pages 1–7
Products Overview...............................................................................................1
Premium Transmission Sampling Kit...................................................................2
Standard Transmission Sampling Kit ..................................................................3
Comprehensive Transmission Sampling Kit.........................................................4
Educational Transmission Sampling Kit...............................................................5
Valu-Line Kit........................................................................................................6
Ultima Sampling Kit.............................................................................................7
Attenuated Total Reflectance – Liquids, Solids and In-Between
Pages 9–37
Products Overview...............................................................................................9
MIRacle – Fast and Easy IR Sampling ..................................................................10
Dedicated MIRacle Sampling Tools......................................................................14
GladiATR – Highest Performance Diamond ATR....................................................15
GladiATR Vision – Diamond ATR with Sample View..............................................18
Dedicated GladiATR and GladiATR Vision Sampling Tools –
More Options to Address Your Specific Application Requirements..................20
Multiple Reflection HATR –
Maximum Sensitivity and Highly Versatile FTIR Sampling.............................21
ATRMax II Variable Angle Horizontal ATR Accessory –
HATR for Inquisitive Minds...........................................................................26
VeeMAX III with ATR –
Variable Angle, Single Reflection ATR for Depth Profiling Studies..................29
JetStream ATR Accessory –
Measurements of Liquids under Varying Conditions......................................32
Classic VATR –
Variable Angle ATR for Analysis of Solids, Films and Coatings.......................34
Theory and Applications......................................................................................35
Diffuse Reflectance – From Powders to Plastic Bumpers
Pages 39–48
Products Overview...............................................................................................39
EasiDiff – Workhorse Diffuse Reflectance Accessory...............................................40
DiffusIR – Research Grade Diffuse Reflectance Accessory.......................................41
UpIR – Upward Looking Diffuse Reflectance Accessory..........................................43
AutoDiff – Automated Diffuse Reflectance Sampling.............................................44
X, Y Autosampler – Transmission and Reflectance Automated
Sampling in Microplate Format....................................................................45
Sample Preparation and Loading Kit –
The Easiest Way to Work With Powder Samples.............................................46
Abrasion Sampling Kit.........................................................................................46
Theory and Applications......................................................................................47
Table Of Contents
Specular Reflectance – Thin Films and More
Pages 49–58
Products Overview...............................................................................................49
VeeMAX III – The Ultimate Variable Angle Specular Reflectance Accessory.................50
10Spec – Near-normal Sample Reflectivity Measurements.....................................52
30Spec and 45Spec – Specular Reflectance for Thick Films....................................53
80Spec – Grazing Angle Specular Reflectance for Thin Films..................................54
AGA – Advanced Grazing Angle Specular Reflectance for Thin Films
with Precise Spot Control................................................................................55
Absolute Reflectance Accessory – Measure Absolute Sample Reflectivity..................56
Theory and Applications......................................................................................57
Polarization – For Oriented Samples and Research Applications
Pages 59–62
Products Overview...............................................................................................59
Polarizers – Manual and Automated Versions for Molecular Spectroscopy............60
Theory and Applications......................................................................................61
Integrating Spheres – Reflectance From All Perspectives
Pages 63–70
Products Overview...............................................................................................63
Mid-IR IntegratIR – Integrating Sphere.................................................................64
External Integrating Sphere – Precise Reflectivity Measurements..........................66
NIR IntegratIR – Integrating Sphere......................................................................67
Introduction and Theory......................................................................................69
Remote Sampling Accessories – Extending Your Sample Compartment
Pages 71–77
Products Overview...............................................................................................71
Mid-IR FlexIR – Hollow Waveguide Accessory for Remote Infrared Sampling.........72
NIR FlexIR –
NIR Fiber Optic Accessory for Fast and Remote Sample Identification...............75
Introduction and Applications............................................................................76
Microsampling Products – From Microns to Millimeters
Pages 79–87
Products Overview...............................................................................................79
µMAX – Sample Compartment Microscope for FTIR...............................................80
Microsampling Tools – Compression Cells and Sample Manipulation...................83
Micro Diamond Cell – For Compressing and Holding Samples for Microanalysis.............84
Compact Transmission/Reflection S100 Microscope Heat Stage –
High Temp Measurements under Vacuum or Controlled Gas Flow.................85
Beam Condensers – 4X and 6X Versions for FTIR..................................................86
Table Of Contents
Transmission Sampling – Automated & Manual Technologies
Pages 89–125
Products Overview...............................................................................................89
Transmission Multi-SamplIR – Automated In-Sample Compartment Accessory.........90
RotatIR – Automated Rotating Sample Stage........................................................91
Automated Horizontal Transmission Accessories – For Films or Pellets................92
X , Y Autosampler –
Transmission and Reflection, Automated Sampling in Microplate Format.....93
Liquid Samples
Press-On Demountable Cell – For Viscous Liquids and Mulls................................94
Demountable Liquid Cells – For Versatile Pathlength Liquid Sampling.................95
Super-Sealed Liquid Cells – For Precision, Fixed Pathlength Liquid Sampling.............96
Long-Path Quartz Liquid Cells –
For Analysis of Hydrocarbon Content and Related Measurements.................97
Falcon Mid-IR Transmission Accessory –
For Precise Temperature Control of Demountable Liquid Cells......................98
Falcon NIR Transmission Accessory – Quantitative and Qualitative
Analysis of Liquids under Precise Temperature Control.................................100
Cryostat190 – Ultralow Temperature Accessory for Liquids and Solids.................101
Solid Samples
Cryostat190 – Ultralow Temperature Accessory for Liquids and Solids.................101
Heated Solid Transmission Accessory –
Measurements of Optical Components and Polymers....................................102
Bolt Press & Hydraulic Die – Low-Cost Pellet Preparation.....................................103
Hand Press – For Making Smaller Pellets..............................................................103
Evacuable Pellet Press – For Preparation of High Quality Pellets.........................104
Pixie – Manual Hydraulic Press.............................................................................. 105
CrushIR – Digital Hydraulic Press.........................................................................106
Heated Platens Accessory – For Making Thin Films of Polymeric Samples............107
ShakIR and Super ShakIR – For Optimized Sample Mixing....................................108
Sample Preparation Accessories – For Solid Material Analysis..............................109
Optical and Sampling Components, Polishing Kits
Sample Holders – For Transmission FTIR Analysis of Pellets and Films.................110
Disks, Windows and Powders – For Transmission FTIR Analysis..............................111
Crystal Polishing Kit – Extending the Life of IR Transparent Windows...................114
Gas Samples
Short-Path Gas Cells – For Samples with Higher Vapor Phase Concentration..............115
Heated Gas Flow Cell – For Streaming Gas Analysis..............................................116
Low-Volume Heated Gas Cell –
Near-Instantaneous Feedback on Compositional Changes................................117
Stainless Steel Short-Path Gas Cells –
For Measuring High Concentration Vapor Components....................................118
Long-Path Gas Cells – For Measuring Low Concentration Vapor Components........120
Theory and Applications......................................................................................123
Table Of Contents
Special Applications
Pages 127–137
Products Overview.............................................................................................. 127
Vertical Wafer Accessory – For Analysis of Semiconductor Wafers........................128
MappIR and MAP300 – For Automated Analysis of Semiconductor Wafers...........129
TGA/FTIR Accessory – Identification and Quantification of Evolved Gases
from Thermogravimetric Analyzer................................................................131
GC-FTIR Accessory –
Combining GC Separation with Identification Power of FTIR.........................133
External Sample Module – Extending Sampling Efficiency...................................134
PA301 and PA101 – Photoacoustic Accessory for Analysis of
Difficult Samples and Depth Profiling...........................................................135
Semiconductor Applications – FTIR Sampling Techniques Overview....................137
UV-Vis Accessories
Pages 139–154
Products Overview...............................................................................................139
UV-Vis Cuvettes, Cells, Vials and Holders.............................................................140
Peltier-Controlled Cuvette Holders for UV-Vis Spectrophotometers –
Experiments Under Tightly Controlled Temperature Conditions.....................142
Falcon UV-VIS – Precise Cell Temperature Control Accessory.................................144
UV-Vis DiffusIR – Diffuse Reflectance Accessory...................................................... 145
UV-Vis Polarizers – Manual and Automated Versions...........................................147
UV-Vis Nanowire Grid Polarizers – Manual and Automated Versions.................... 148
UV-Vis Spec – Slide Mounted Specular Reflectance Accessories..............................149
UV-Vis 10Spec – For Near Normal Reflectivity Measurements................................ 150
UV-VIS 85Spec – Specular Reflectance Accessory...................................................151
UV-Vis VeeMAX – Variable Angle Specular Reflectance Accessory...........................152
Out-of-Compartment Microplate Reader –
Plate Reading Option for UV-Vis Spectrophotometers....................................153
Automated XY, R-Theta and Y-rotation Stages –
For UV-Vis Spectrophotometers.....................................................................154
Standards, Software and Databases
Pages 155–161
Products Overview...............................................................................................155
Reference Standards – For Calibrating FTIR Spectrometers...................................156
PIKECalc Software – For FTIR Sampling Computations..........................................159
ATR Spectral Databases – Optimize Search Results for ATR Spectral Data.............160
Transmission Spectral Databases –
High-Quality Spectral Data for Optimized Search Results..............................161
Order Terms, Contact Information, Guarantee.....................................................163
FTIR and UV-Vis Instrument Codes.......................................................................164
Catalog Index – Alphabetical................................................................................165
Educational Poster
11 x 17” Printable Educational Poster
FT-IR Sampling Techniques
• Attributes
• Applications
• Sample Handling Tips
• And More!
Download FREE PDF >
Sampling Kits
If you are not sure where to start, check out PIKE Technologies’
sampling kits. You will immediately find everything you need
for the most basic FTIR experiments, and you will be able to
collect your first spectrum in less than 30 minutes from the time
the kit arrives.
The kits are carefully designed to include all necessary
components. They eliminate guesswork and assure that you have
everything you need for immediate productivity.
Premium Transmission Sampling Kit Page 2
Highest-performance, single reflection ATR
and back-up accessories to do it all!
Standard Transmission Sampling Kit Page 3
Everything you need to run liquid and solid
samples by transmission IR spectroscopy
Comprehensive Transmission Sampling Kit Page 4
Complete gas, liquid and solid sampling
Educational Transmission Sampling Kit Page 5
An economical assembly of FTIR sampling tools
for transmission sampling
Valu-Line Kit Page 6
High-performance set of modern FTIR accessories
addressing all solid and liquid sampling needs
Ultima Sampling Kit Page 7
Highest-performance, single reflection ATR
and back-up accessories to do it all!
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Premium Transmission Sampling Kit – All the Tools for Easy
Preparation of Transmission Measurements of Liquids and Solids
A Great Place To Start
The Premium Transmission Sampling Kit is a general purpose kit
containing tools and materials for liquid and solid sampling. A
demountable cell (drilled and undrilled windows with precision
Teflon spacers, plus 2” x 3” standard cell holder) is provided for
measurements of liquid samples. Viscous liquids can be measured
directly as a thin film between the KBr windows. The kit includes
a small bench top hydraulic press for the easy preparation of
7-mm KBr pellets. A mortar with pestle and Nujol™/Fluorolube®
are provided for mull making – another popular method for
preparation of solid samples. In addition, the kit contains a set of
the most popular sample holders including the universal holder
for polymer films, KBr pellet holder and PIKE disposable/storage
cardboard cards for pellets and polymer films. For a complete
product listing, please refer to the table below.
O r d e r i n g I n fo r m a t i o n
Part Number Description
162-1010
Premium Transmission Sampling Kit
Includes Pixie hydraulic pellet press, sample preparation tools,
mull liquids, cells, windows and cell holders required
for preparation and analysis of solid and liquid samples
I ncluded P arts and M aterials
Part Number Description
Features
• Complete kit for transmission FTIR sampling
• Pixie small hydraulic press for making KBr pellets
• Making mulls for solid samples
• Run liquid samples for qualitative and quantitative
analysis
160-8010
KBr Powder, 100 g
161-0510
Fluorolube, 1 oz
161-0500
Nujol, 1 oz
042-3035
Spatula, spoon
042-3050
Spatula, flat
161-5030
Mortar and Pestle, 35 mm
181-1400
Pixie Hydraulic Pellet Press
161-1010
7-mm Die Set
161-1011
7-mm Collar
161-1018 KBr Pellet Holder
161-6000
Finger Cots (12 ea.)
162-1100
Demountable Liquid Cell Assembly
160-1010
Window, KBr, 32 x 3 mm (6 ea.)
160-1015
Window, KBr, 32 x 3 mm, drilled (6 ea.)
162-1290
Teflon Spacers, assortment
161-0521
Syringe, 2 mL (2 ea. in kit)
162-3610 Press-On Demountable Liquid Cell Holder for 32-mm windows
162-5600
Universal Sample Holder*
162-5300
Magnetic Film Holder for 13-mm pellets and film samples
162-5400
Film Sampling Card, 20-mm clear aperture (10 ea.)*
* Note: Cell holders marked “*” fit all standard slide mounts, but due to their
height may not allow for a complete sample compartment door closure on some
smaller spectrometers. Please consult PIKE Technologies before placing an order.
2
Standard Transmission Sampling Kit – Everything You Need to
Run Liquid and Solid Samples by Transmission IR Spectroscopy
O r d e r i n g I n fo r m a t i o n
S ampling K its
This general purpose kit contains tools and materials for liquid
and solid sampling. A demountable cell (drilled and undrilled
windows with precision Teflon™ spacers, plus 2” x 3” standard cell
holder) is provided for measurements of liquid samples. Viscous
liquids can be measured directly as a thin film between the KBr
windows. The kit includes a hand-operated press for the preparation
of 7-mm KBr pellets. A mortar with pestle and Nujol™/Fluorolube®
are provided for mull making – another popular method for
preparation of solid samples. In addition, the kit contains a set of
the most popular sample holders including a universal holder for
polymer films, a KBr pellet holder and PIKE disposable/storage
cardboard cards for pellets and polymer films. For a complete
product listing, please refer to the table below.
Part Number Description
162-1000
Standard Transmission Sampling Kit
Includes sample preparation tools, mull liquids, cells, windows
and cell holders required for preparation and analysis of solid
and liquid samples
I ncluded P arts and M aterials
Part Number Description
Features
analysis
• Convenient padded carrying and storage case
Fluorolube, 1 oz
161-0500
Nujol, 1 oz
042-3035
Spatula, spoon
042-3050
Spatula, flat
161-5035
Mortar and Pestle, 35 mm
161-1027
PIKE Hand Press for KBr pellets
161-1010
7-mm Die Set
161-1018 KBr Pellet Holder
161-6000
Finger Cots (12 ea.)
162-1100
Demountable Liquid Cell Assembly
160-1010
Window, KBr, 32 x 3 mm (6 ea.)
160-1015
Window, KBr, 32 x 3 mm, drilled (6 ea.)
162-1290
Teflon Spacers, assortment
161-0521
Syringe, 2 mL (2 ea. in kit)
162-3610 Press-On Demountable Liquid Cell Holder for 32-mm windows
162-5600
Universal Sample Holder*
162-5300
Magnetic Film Holder for 13-mm pellets and film samples
162-5400
Film Sampling Card, 20-mm clear aperture (10 ea.)*
* Note: Cell holders marked “*” fit all standard slide mounts, but due to their
height may not allow for a complete sample compartment door closure on some
smaller spectrometers. Please consult PIKE Technologies before placing an order.
www.piketech.com
KBr Powder, 100 g
161-0510
Pike Technologies
• Complete kit for transmission FTIR sampling
• Make KBr pellets and mulls for solid samples
• Run liquid samples for qualitative and quantitative
160-8010
608-274-2721
3
Comprehensive Transmission Sampling Kit –
Complete Gas, Liquid and Solid Sampling
A Great Place To Start
The Comprehensive Transmission Sampling Kit includes a 100-mm
pathlength, 38-mm diameter gas cell, in addition to all the
sample preparation and mounting tools described in the Standard
Transmission Sampling Kit on the previous page. The cell body is
made of Pyrex® glass and features straight-tube inlet and outlet
ports with stopcocks. The gas cell comes with all necessary
gaskets, two KBr windows and slide-mounted cell holder, and
is designed for gas measurements at ambient temperature and
normal atmospheric pressure.
O r d e r i n g I n fo r m a t i o n
Part Number Description
162-2000
Comprehensive Transmission Sampling Kit
Includes sample preparation tools, mull liquids, cells,
windows and cell holders required for preparation and
analysis of gas, solid and liquid samples
I ncluded P arts and M aterials
Part Number Description
Features
• Complete sampling kit for analysis of solids, liquids
and gas samples by transmission
• Make KBr pellets and mulls for solid samples
• Run qualitative and quantitative analysis of liquid samples
• Identify and quantify gas samples
• Convenient padded carrying and storage case
160-8010
KBr Powder, 100 g
161-0510
Fluorolube®, 1 oz
161-0500
Nujol™, 1 oz
042-3035
Spatula, spoon
042-3050
Spatula, flat
161-5035
Mortar and Pestle, 35 mm
161-1027
PIKE Hand Press for KBr pellets
161-1010
7-mm Die Set
161-1018 KBr Pellet Holder
161-6000
Finger Cots (12 ea.)
162-5300
Magnetic Film Holder for 13-mm pellets and film samples
162-1100
Demountable Liquid Cell Assembly
160-1010
KBr Window, 32 x 3 mm (6 ea.)
160-1015
KBr Window, 32 x 3 mm, drilled (6 ea.)
162-1290
Teflon® Spacers, assortment
161-0521
Syringe, 2 mL (2 ea. in kit)
162-3610 Press-On Demountable Liquid Cell Holder for 32-mm windows
162-5600
Universal Sample Holder*
162-2200
Gas Cell, 100-mm pathlength, 38-mm diameter
160-1320
Window, KBr, 38 x 6 mm (2 ea. in kit)
162-5400
Film Sampling Card, 20-mm clear aperture (10 ea.)*
* Note: Cell holders marked “*” fit all standard slide mounts, but due to their
height may not allow for a complete sample compartment door closure on some
smaller spectrometers. Please consult PIKE Technologies before placing an order.
4
Educational Transmission Sampling Kit –
An Economical Assembly of Sampling Tools
O r d e r i n g I n fo r m a t i o n
Part Number Description
162-3000
Educational Transmission Sampling Kit
Includes sample preparation tools, mull liquids, cells,
windows and cell holders required for preparation and
analysis of gas, solid and liquid samples
I ncluded P arts and M aterials
S ampling K its
The Educational Sampling Kit contains all necessary tools for the
analysis of gas, liquid and solid samples. It was designed as a
low-cost alternative for busy teaching laboratories. The kit offers a
100 mm x 25 mm gas cell with straight, septa protected tubes, a bolt
press for making KBr pellets and a 35-mm mortar and pestle. Please
refer to the table below for the detailed list of all components.
Part Number Description
Features
KBr Powder, 100 g
162-1100
Demountable Liquid Cell Assembly
161-0510
Fluorolube®, 1 oz
161-0500
Nujol™, 1 oz
160-1010
Window, KBr, 32 x 3 mm (6 ea.)
160-1015
Window, KBr, 32 x 3 mm, drilled (6 ea.)
042-3035
Spatula, spoon
042-3050
Spatula, flat
162-1290
Teflon® Spacers, assortment
161-0521
Syringe, 2 mL (2 ea. in kit)
161-5035
Mortar and Pestle, 35 mm
162-3610 Press-On Demountable Liquid Cell Holder for 32-mm windows
161-2500
Bolt Press for KBr pellets
161-2511
Wrench Set for bolt press (2 ea.)
162-2100
Gas Cell, 100-mm pathlength, 25-mm diameter
160-1133
Window, KBr, 25 x 4 mm (2 ea. in kit)
161-6000
Finger Cots (12 ea.)
162-5300
Magnetic Film Holder for 13-mm pellets and film samples
162-5400
Film Sampling Card, 20-mm clear aperture (10 ea.)*
www.piketech.com
* Note: Cell holders marked “*” fit all standard slide mounts, but due to their
height may not allow for a complete sample compartment door closure on some
smaller spectrometers. Please consult PIKE Technologies before placing an order.
Pike Technologies
• Basic sampling kit for transmission FTIR sampling
• Perform qualitative and quantitative analysis
• Economical analysis of solids, liquids and gases
• Convenient padded carrying and storage case
160-8010
608-274-2721
5
Valu-Line Kit – High-Performance Set of FTIR Accessories
Addressing All Solid and Liquid Sampling Needs
A Great Place To Start
The number of available FTIR accessories can be overwhelming.
Sometimes, it is not easy to decide which accessory will do the job.
An answer to this problem is PIKE Technologies’ Valu-Line Accessory
Kit. This kit, packaged in a durable and convenient storage case,
combines the most often used and practical set of FTIR sampling
accessories. It includes the following components:
HATR – Multiple Reflection Horizontal ATR
Designed to analyze liquid and semi-liquid samples, pastes, gels, films,
soft powders and multiple solid materials. This accessory comes with
trough and flat crystal plates to accommodate all types of samples.
The HATR is carefully designed to provide excellent results with
minimum effort. It can be easily placed in the sample compartment
and locked into position on the sample compartment baseplate, or a
standard slide holder.
EasiDiff – Diffuse Reflectance Accessory
An ideal accessory for the analysis of powders and intractable
solids. With a set of convenient tools for solid sample preparation,
this compact, high-performance accessory provides outstanding
collection efficiency.
30Spec – Specular Reflectance Accessory
Features
• Combination of most widely used FTIR accessories:
Multiple Reflection Horizontal ATR
Diffuse Reflectance
30-Degree Specular Reflectance
• Full range of sampling options and applications
• Complete set of auxiliary sample preparation tools for
immediate productivity
• Pre-aligned, fixed-position optical designs offering
reproducible, high-quality data
• High-performance accessories providing excellent
sampling sensitivity
• Economical and logical addition to any FTIR
spectrometer.
• Excellent starter kit for routine applications, research or
teaching
A great accessory for the analysis of thin organic films deposited
on reflective surfaces and a myriad of surface coatings and surface
treatments. The 30Spec is slide-mounted and comes with a set of
three masks which allow for the isolation of small, predetermined
spots on larger samples, and the analysis of small samples.
Please refer to the appropriate sections of the catalog for additional
details about these accessories.
O r d e r i n g I n fo r m a t i o n
Part Number Description
050-10XX
Valu-Line Kit
Includes:
HATR – combined trough and flat plate system,
including 45-degree ZnSe crystal trough and flat plate,
volatiles cover, powder press and sample clamp
EasiDiff – diffuse reflectance accessory with two micro and
two macro sample cups, EasiPrep sample preparation kit,
alignment mirror, mortar and pestle, and KBr
30Spec – specular reflectance accessory with set of three
masks for control of sampling spot size
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Add -GE, -KR, -SI or -AM to the part number to substitute the following HATR crystal
plates: Germanium, KRS-5, Silicon or AMTIR.
6
Ultima Sampling Kit – Highest-Performance, Single Reflection ATR
and Backup Accessories to Do it All
MIRacle – Single Reflection ATR
Designed to analyze a wide variety of solid and liquid samples. It
offers a number of unique features including a universal sampling
plate which accommodates liquids, solids and powders, a small
sampling interface (1.8 mm) making the analysis of small and/or
awkward samples easy, and interchangeable sampling plates. All the
above options allow for the best selection of an appropriate
spectral range, and a configuration which matches the optical,
physical and chemical properties of analyzed samples. The patented
optical design of the accessory offers the highest energy throughput
and maximum sensitivity. The MIRacle in this kit is equipped with a
pressure clamp and purge attachments.
S ampling K its
Other samples still need to be analyzed by other methods,
especially when dealing with poor absorbers, some powders and
films. For this reason, PIKE designed an accessory kit built around
the MIRacle – Single Reflection ATR, and also included basic diffuse
reflectance and specular reflectance accessories. This combination
offers a complete range of sampling devices used in FTIR and covers
a wide variety of sampling needs. The Ultima Sampling Kit contains
the following accessories:
EasiDiff – Diffuse Reflectance Accessory
An ideal product for the analysis of powders and intractable
solids. With a set of convenient tools for sample preparation,
this compact, high-performance accessory provides outstanding
collection efficiency.
Features
• Complete kit for ATR, diffuse reflectance, and specular
reflectance sampling techniques
• High-performance accessories eliminate tedious pellet
• Analysis of liquids, solids, powders, polymers and thin
film samples
Please refer to the appropriate sections of the catalog to review
the theory and detailed descriptions of kit components.
O r d e r i n g I n fo r m a t i o n
Part Number Description
Ultima Sampling Kit
Includes:
MIRacle – single reflection ATR with ZnSe crystal,
universal configuration for solid and liquid analysis, and
high-pressure clamp
EasiDiff – diffuse reflectance accessory with sampling tools,
two micro and two macro sample cups, EasiPrep sample
preparation kit, alignment mirror, mortar and pestle, and KBr
30Spec – specular reflectance accessory with set of three
masks for control of sampling spot size
050-20XX-DI
Ultima Sampling Kit with Diamond ATR
Includes:
MIRacle – single reflection ATR with diamond/ZnSe crystal,
universal configuration for solid and liquid analysis, and
high-pressure clamp
EasiDiff – diffuse reflectance accessory with sampling tools,
two micro and two macro sample cups, EasiPrep sample
preparation kit, alignment mirror, mortar and pestle, and KBr
30Spec – specular reflectance accessory with set of three
masks for control of sampling spot size
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Add -GE or -SI to part number 050-20XX to substitute Germanium or Silicon MIRacle
crystal plates.
608-274-2721
050-20XX
www.piketech.com
In recent years, single reflection ATR measurements have become
quite popular for two main reasons – they simplify sample
preparation and reduce the complexity of traditional FTIR
measurements. This is achieved through the reduction of the
sampling area (smaller sample volume/size requirement), ease of
cleaning and the introduction of more rigid, diamond-protected
sampling interface, capable of withstanding higher pressures and
harder samples. The single reflection ATR is capable of analyzing a
wide variety of samples – including rigid solids and hard powders –
which are difficult to achieve with a multi-reflection ATR. For these
reasons, the single reflection ATR has gained the reputation of being
a universal sampling device.
A great accessory for the analysis of thin organic films deposited
on reflective surfaces and a myriad of surface coatings and surface
treatments. The 30Spec is slide-mounted and comes with a set of
three masks which allow for the isolation of small, predetermined
spots on larger samples, and the analysis of small samples.
Pike Technologies
making
30Spec – Specular Reflectance Accessory
7
PIKE MIRacle
TM
—
The Most Configurable ATR!
View our video to learn more >
Attenuated Total
Reflectance
ATR products successfully replace constant-path transmission
cells and salt plates used for analysis of liquid and semi-liquid
materials. Horizontal ATR accessories are used to analyze films,
pastes, solids and fine powders. Thanks to the reproducible effective
pathlength, ATR is well suited for both qualitative and quantitative
applications. Several temperature control options are available.
MIRacle™ Page 10
Single Reflection ATR
Ideal for sample identification
GladiATR™ Page 15
Monolithic Diamond Single Reflection ATR
For intractable samples and temperature studies
GladiATR™ Vision Page 18
Monolithic Diamond ATR with Sample Viewing
Easy positioning and analysis of intractable samples
HATR Page 21
Multi-Reflection ATR
Highest sensitivity for minor components
ATRMax™ II Page 26
Variable Angle, Multi-Reflection ATR
Research-grade ATR
VeeMAX™ III ATR Page 29
Variable Angle, Single Reflection ATR
For depth profiling studies and monolayers
JetStream ATR Page 32
Cylindrical Crystal ATR
For measurement of liquids under varying conditions
Theory and
Applications
Page 35
VATR™ Page 34
Classic Variable Angle ATR
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Liquids, Solids and In-Between
MIRacle ATR – Fast and Easy IR Sampling
%Throughput
PIKE MIRacle ATR
ATR #2
ATR #3
MIRacle – Highest IR Throughput ATR.
The PIKE MIRacle™ is a universal ATR sampling accessory for analysis
of solids, liquids, pastes, gels, and intractable materials. In its most
popular configuration it is a single reflection ATR accessory with high
IR throughput which makes it ideal for sample identification and
QA/QC applications. Easily changeable crystal plate design provides
analysis of a broad spectrum of sample types while ensuring
constant sampling pathlength. An assortment of crystal materials
and single, three and nine reflection ATR crystals are available to
optimize general qualitative or quantitative analysis.
Features
• Highest IR throughput – saving you time and improving
your analysis quality
• Complete flexibility – add options to your MIRacle as your
sampling needs change
• Highest value – for today’s competitive analytical and
research needs
• Fully configurable – diamond, ZnSe, Ge and Si MIRacle
crystal plates; single or multiple reflections
• Pinned-in-place, changeable crystal plates – for fast and
easy sampling optimization
• Highest purity, type IIa diamond crystal – will not scratch
and is chemically inert to acidic or caustic materials
• Optional specular reflectance plate – for measurement of
coatings on reflective surfaces
• Choice of pressure clamps – high-pressure, digital
high-pressure and micrometric sample clamps
• Sampling options – temperature control, flow-through
attachment and sealed clamp
Faux black pearl, using MIRacle diamond ATR crystal.
MIRacle Optical Design
In the patented MIRacle optical design the ATR crystal focuses the IR
beam and also provides the ATR sampling interface. This technology
delivers greater energy throughput than competitive products,
saves considerable time and produces higher quality spectra. For
the single reflection, the small sampling surface results in increased
force per unit area for improved contact between rigid samples and
the ATR crystal.
Evanescent Wave
Diamond ATR Crystal
Beam path through MIRacle crystal optic.
11
Base ATR Focus Optics
Hydrogel, using three reflection diamond/ZnSe crystal (red) and single
reflection diamond/ZnSe (blue).
MIRacle Crystal Options
Black rubber samples are best run using Ge ATR crystal.
Pike Technologies
The MIRacle ATR accessory may be configured with five different
crystal types: diamond/ZnSe, diamond/KRS-5, ZnSe, Ge and Si.
1-, 3- and 9-reflection styles are available. Trough and flat plate
configurations are options for the multiple reflection plates.
Crystal plates are pinned in place and easily changeable
within seconds with no alignment required. With this flexibility,
you can change the crystal type to exactly match your sampling
requirements. For example, diamond is ideal for brittle samples
because it will not scratch, whereas Ge is ideal for carbon-filled
samples because of its high refractive index and lower depth
of penetration. Two single reflection diamond crystal plates are
available, diamond/ZnSe and diamond/KRS-5. The latter offers a
full spectral range to 250 cm-1. 3- and 9-reflection crystal plates
provide increased sensitivity for minor components in liquid
samples. 3-reflection diamond/ZnSe crystal plates are available in
flat and trough style, and 9-reflection diamond/ZnSe is offered in
trough style only.
A t tenuated T otal R eflectance
MIRacle crystal plates. Clockwise: diamond/ZnSe, diamond/KRS-5, ZnSe,
Ge and Si.
9-reflection trough plate, 3-reflection flat plate, specular reflectance plate
Toluene sample collected using diamond/KRS-5 crystal.
T able 1: MIR acle C rystal P late S pecifications
Refractive Index @ MIRacle Hardness Cutoff cm-1,
Crystal Plate Application
kg/mm2 Spectral Range 1000 cm-1
Depth of
Penetration @ 45°, µ
pH Range
of Sample
1–14
Ideal for hard samples, acids or alkaline
5700
525
2.4
2.00
When you need full mid-IR spectral range
5700
250
2.4
2.00
1–14
Ge
General purpose and carbon filled or rubber
550
575
4.0
0.66
1–14
Si
Excellent for far-IR spectral measurement
1150
8900 –1500, 475–40
3.4
0.85
1–12
ZnSe
General purpose ATR crystal
120
520
2.4
2.00
5 –9
MIRacle crystal plates are covered by PIKE Technologies patent numbers 5,965,889 and 6,128,075 or are manufactured under license of 5,200,609,
5,552,604 and 5,703,366.
608-274-2721
Diamond/ZnSe
Diamond/KRS-5
www.piketech.com
Table 1 shows MIRacle ATR crystal characteristics including
refractive index, spectral range cutoff, pH range and hardness for
single reflection ATR crystal plates. Still have questions? Please
contact us as we are pleased to discuss your sampling requirements.
12
Liquids, Solids and In-Between
MIRacle Digital
Clamp – ideal for
controlled pressure
MIRacle Confined
Space Clamp – for
instruments with
limited area in
sample compartment
­­­MIRacle Pressure Clamp Options
MIRacle pressure clamps are pinned in place and easily changeable
within seconds. A high-pressure clamp is recommended for most
applications and is available in basic and digital configurations.
The digital version requires a high-pressure clamp and the Digital
Force Adapter (DFA) that attaches directly to the clamping assembly.
The DFA’s embedded load cell exhibits high linearity, reproducibility,
and exceptional accuracy. The magnitude of applied force is
displayed on an external easy-to-read LCD readout. The digital clamp
is ideal for applications that require controlled and reproducible
pressure. All clamps include tips for hard, soft and pellet-shaped
samples. High-pressure clamps are calibrated to deliver over
10,000 psi of pressure when used with the single reflection
crystal plates, and utilize a slip-clutch mechanism to prevent
excessive pressure from being applied to the crystal.
Ability to deliver high pressure is very important for achieving
spectral quality. In the example to the right, we demonstrate
spectral differences of a porous polymer sample measured with the
micrometer clamp and the high-pressure clamp. Clearly the highpressure clamp is required to obtain a high-quality spectrum.
MIRacle High-Pressure
Clamp – ideal for
routine sampling
MIRacle Micrometer
Clamp – for low
pressure applications
MIRacle Clamp Pressures Max Force, Crystal Pressure,
lbsDiameter, mmpsi
High-Pressure Clamps
40
Micrometer Pressure Clamp8
1.810,141
6.0913
1.82,028
6.0183
Note: All clamps except Micrometer are high-pressure.
Porous polymer sample measured using high- and low-pressure clamp.
Temperature Control
MIRacle ATR Summary
The MIRacle can be configured with liquid jacketed plates and
resistively heated crystal plates with temperature control module.
The PC module (resistively heated only) includes PIKE TempPRO
software which provides a graphical user interface for temperature
control and kinetics measurements. The liquid jacketed plates
require user-provided liquid circulator.
The MIRacle ATR accessory is a high-performance FTIR sampling
tool for solid, liquid, or polymer samples. Easily changeable crystal
plates provide optimized spectral data for unique sample types.
With options for single, three or nine reflection crystal plates, several
pressure clamp styles and heating or cooling, the MIRacle is able to
address a wide range of FTIR sampling applications.
TempPRO software for graphical setup and control of
kinetic measurements.
13
O r d e r i n g I n fo r m a t i o n
MIR acle S ampling O ptions
Part Number Description
Part Number Description
025-18XXMIRacle ATR Base Optics/Platform Assembly
025-4018 Heated ZnSe Performance Crystal Plate
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
MIRacle Base Optics includes purge tubes, purge kit and spectrometer base mount.
025-4058 Heated Ge Performance Crystal Plate
025-4108 Heated Diamond/ZnSe Performance Crystal Plate
(60 °C max.)
C rystal P lates for MIR acle (must select 1 or more)
025-2108
Diamond/ZnSe Performance Crystal Plate
025-2104 Liquid Jacketed Diamond/ZnSe Performance Crystal Plate,
(60 °C max.)
025-2107
Diamond/ZnSe HS Performance Crystal Plate
025-2014 Liquid Jacketed ZnSe Performance Crystal Plate
025-2028
Diamond/KRS-5 Performance Crystal Plate
025-2054 Liquid Jacketed Ge Performance Crystal Plate
025-2027
Diamond/KRS-5 HS Performance Crystal Plate
025-2094 Liquid Jacketed Si Performance Crystal Plate
025-2018
ZnSe Performance Crystal Plate
026-5012 Flow-Through Attachment, 100 µL
025-2058
Ge Performance Crystal Plate
026-5013
Liquids Retainer and Volatiles Cover Set
Si Performance Crystal Plate
026-3051 Volatiles Cover for Performance Plates
025-2118
3-Reflection Diamond/ZnSe Performance Crystal Plate
026-5010 Liquids Retainer for Performance Plates
025-2120
3-Reflection Diamond/ZnSe Performance Crystal Plate, Trough
076-1220 Digital Temperature Control Module
3-Reflection ZnSe Performance Crystal Plate
076-1420 Digital Temperature Control Module, PC Control
Part Number Description
025-2098
025-2038
025-2218
9-Reflection Diamond/ZnSe Performance Crystal Plate, Trough
025-2208
Specular Reflection Performance Plate
Notes: MIRacle crystal plates are pre-aligned and pinned in place. Changing crystal
plates is easy and fast to optimize sampling results. Crystal plate housings are
manufactured using polished stainless steel for chemical resistance. The diamond/
ZnSe and diamond/KRS-5 crystal plate is available with optional Hastelloy® (HS)
metal for exceptionally caustic or acidic samples.
Notes: Flow-Through Attachment, Liquids Retainer and Volatiles Cover are
compatible with non-trough crystal plate offerings and require High-Pressure
Clamp, P/N 025-3020 or P/N 025-3035, sold separately. Temperature control
module selection is required for heated crystal plates. Digital temperature control
module with PC control includes TempPRO software. Liquid jacketed crystal plates
require customer-provided circulator. Do not exceed 60 oC when using temperature
controlled diamond plates and 130 oC for all others.
A t tenuated T otal R eflectance
MIR acle B ase O ptics (must select)
P ressure C lamps for MIR acle
(must select clamp for solids or polymer analysis)
Specifications
Part Number Description
High-Pressure Clamp
Diamond/ZnSe, Diamond/KRS-5, Ge,
ZnSe, Si
076-6025 Digital Force Adapter for High-Pressure Clamp
Crystal Plate Mounting
User-changeable plates
025-3050 Micrometric, Low-Pressure Clamp
Crystal Plate Mount
Stainless steel or Hastelloy
025-3035
High-Pressure Confined Space Clamp
45 degrees, nominal
076-6028
Digital Force Adapter for High-Pressure Confined
Space Clamp
Angle of Incidence
Crystal Dimensions, surface 1.8 mm single reflection
6.0 mm three and nine reflection
Pressure DeviceRotating, continuously variable pressure;
click-stop at maximum (High-Pressure Clamp)
Digital Force Adapter
(option)
Load cell sensor for precise and
r eproducible pressure control.
Attaches directly to High-Pressure
MIRacle clamps. Digital readout.
Not for use with heated plates.
10,000 psi
Sample Access
55 mm, ATR crystal to pressure mount
Heating Options
Ambient to 60 or 130 ºC maximum
R eplacement P arts
Part Number Description
025-3095
Flat Tip for High-Pressure Clamp
025-3093
Swivel Tip for High-Pressure Clamp
025-3092
Concave Tip for High-Pressure Clamp
025-3052
Flat Tip for Micrometric Clamp
025-3061
Swivel Tip for Micrometric Clamp
Temperature Control Digital or digital with PC control (up to
20 ramps, automated data collection,
USB interface)
025-3054
Concave Tip for Micrometric Clamp
025-3053
MIRacle Micrometer Clamp Tip Assortment
025-3094
7.8 mm ATR Pressure Tip for High-Pressure Clamp
025-3096
7.8 mm ATR Pressure Tip for Micrometer Clamp
025-3099
Tip Assortment for High-Pressure Clamp
Accuracy Sensor Type Input Voltage 100–240 VAC, auto setting, external
power supply
Operating Voltage
Specular Reflection
Option
1.3A/24 VDC 30 W
Optional, 45 degree nominal angle
of incidence
Purge SealingPurge tubes and purge line connector
included
Accessory Dimensions (W x D x H)
104 x 103 x 210 mm
(excludes FTIR b
aseplate and mount)
Most, specify model and type
FTIR Compatibility
Notes: Please contact PIKE Technologies for items not described in this list.
Reconditioning service for used MIRacle crystal plates is available.
608-274-2721
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
www.piketech.com
Maximum Pressure
Notes: The High-Pressure Clamp is recommended for general applications. Pressure
clamps include a flat tip, a swivel tip and a concave tip. The Digital Force Adapter
requires High-Pressure Clamp, P/N 025-3020 (sold separately), and may not be used
at temperatures above ambient.
Pike Technologies
025-3020 ATR Crystal Choices
14
Liquids, Solids and In-Between
Dedicated MIRacle Sampling Tools and Options
Sealed Clamp
Flow-Through Attachment
The Sealed Sample Chamber for the MIRacle Single Reflection
ATR accessory attaches to dedicated diamond, ZnSe or Ge crystal
ATR plates allowing the complete assembly to be moved from the
spectrometer to a protective environment for sample handling.
Once the sample has been loaded onto the ATR crystal, the
sealed clamp may be engaged shielding the sample
from the external environment. Typical applications
include studies of toxic or chemically aggressive
solids and powders.
The chamber is made of stainless steel and is
sealed against the crystal plate with a chemically
resistant O-ring. The chamber contains an
internal, spring-loaded anvil that compresses
the sample against the ATR crystal at a
preset, clutch-controlled setting.
The Flow-Through Attachment is used for
continuous monitoring or handling samples
that pose a hazard or are degraded from
ambient exposure. Samples are introduced
using the Luer-Lok™ fitting by connecting
a syringe or a flow line. Swagelok® fittings
are optional. The High-Pressure Clamp
is required.
Specular Reflection Plate
The MIRacle may be converted from an
ATR accessory to a specular reflection
accessory by using the Specular
Reflection Plate. The angle of incidence
is 45 degrees, and the plate is easily
interchangeable with ATR plates.
Liquids Retainer and Volatiles Cover
The Liquids Retainer offers a trough configuration for the MIRacle.
The Volatiles Cover reduces the amount of evaporation of a highly
volatile liquid sample on the surface of
the crystal. The High-Pressure Clamp is
required, and serves to apply pressure to
the u-bridge thus compressing a sealing
PTFE O-ring located underneath the
Liquids Retainer.
O r d e r i n g I n fo r m a t i o n
S ealed H igh -P ressure C lamp for MIR acle (must select the
sealed clamp and at least one crystal ATR plate).
P ART N UMBER D ESCRI P TIO N
Temperature Control Options
The MIRacle can be configured with liquid jacketed plates and
resistively heated crystal plates with temperature control module.
The PC module (resistively heated only) includes PIKE TempPRO
software which provides a graphical user
interface for temperature control and kinetics
measurements. The liquid jacketed
plates require user-provided
liquid circulator.
Digital Force Adapter for High-Pressure Clamp
The Digital Force Adapter attaches directly to the clamping assembly
to precisely measure the applied force by using an embedded load cell
that exhibits high linearity and exceptional accuracy. The magnitude
of applied force is displayed on an
external easy-to-read LCD readout.
The digital clamp is ideal for
applications that require controlled
and reproducible pressure. This
option may not be used with
temperature controlled plates.
15
025-6020
Sealed High-Pressure Clamp
025-6108
Diamond/ZnSe Sealed Clamp Performance Plate
025-6018
ZnSe Sealed Clamp Performance Plate
025-6058
Ge Sealed Clamp Performance Plate
T emperature C ontrolled MIR acle O ptions
P ART N UMBER D ESCRI P TIO N
025-4018
Heated ZnSe Performance Crystal Plate
025-4058
Heated Ge Performance Crystal Plate
025-4108
Heated Diamond/ZnSe Performance Crystal Plate,
(60 °C max.)
025-2104 Liquid Jacketed Diamond/ZnSe Performance Crystal Plate,
(60 °C max.)
025-2014 Liquid Jacketed ZnSe Performance Crystal Plate
025-2054 Liquid Jacketed Ge Performance Crystal Plate
025-2094 Liquid Jacketed Si Performance Crystal Plate
076-1220
Digital Temperature Control Module
076-1420
Digital Temperature Control Module, PC Control
Temperature controller is required for heated crystal plates. Digital temperature
controller, PC control includes PIKE TempPRO software. Liquid jacketed crystal
plates require customer-provided circulator.
M ore MIR acle S ampling O ptions
P ART N UMBER D ESCRI P TIO N
025-2208
Specular Reflection Performance Plate
025-2028
Diamond/KRS-5 Performance Crystal Plate
026-3051
Volatiles Cover for Performance Plates
026-5013
Liquids Retainer and Volatiles Cover Set
076-6025
Digital Force Adapter for High-Pressure Clamp
026-5012
Flow-Through Attachment, 100 ul
The energy throughput of the GladiATR is exceptional; twice
that of other monolithic diamond ATR accessories. This significantly
improves spectral quality and reduces sampling time.
The GladiATR is designed and manufactured using all reflecting
optics providing full spectral range in the mid-IR and far-IR spectral
regions. An optional Ge crystal plate is available for analysis of high
refractive index samples, and offers a spectral range from 5000 – 450
cm-1. The crystal plates are easily changeable.
The GladiATR high performance diamond ATR is available in
configurations to fit most FTIR spectrometers.
A t tenuated T otal R eflectance
GladiATR –
Highest Performance Diamond ATR
ATR/FTIR spectrum of polymer pellet run on GladiATR with diamond
crystal. Spectral range in the mid-IR is 4000–400 cm-1.
Features
Pike Technologies
• Diamond crystal design – cannot scratch or fracture
• Extreme pressure application – for hard and demanding
solid samples
• Highest energy throughput design – for excellent-quality
FTIR spectra and minimum scan time
• All reflective optics – full spectral range for analysis in the
mid-IR and far-IR regions
• Optional extended spectral range Ge crystal plate – for
high refractive index samples
up to 300 °C
• Compatible with most FTIR spectrometers
608-274-2721
The GladiATR™ ATR from PIKE Technologies features an optical
design providing the highest energy throughput, highest available
pressure, widest spectral range and offering optional heated or cooled
crystal plates. The GladiATR is a highly durable and rugged design
to be used in environments where large numbers of samples are
measured, where samples may be intractable solids, where you want
the best quality spectrum every time and where you need flexibility
for new sample types in the future.
The GladiATR diamond crystal is a monolithic design which
will not scratch or fracture even at extreme pressures. This design
permits analysis of hard, intractable objects such as coated metal
wires, polymer pellets and geological samples without damage to the
ATR crystal. The diamond crystal is brazed into the stainless steel or
Hastelloy plate, which enables this ATR to be compatible with pressure
up to 30,000 psi.
Spectrum of sulfathiazole using GladiATR with diamond crystal plate
and far-IR optics in FTIR.
www.piketech.com
• Heated crystal plate options – ATR temperature studies
Spectrum of bromoacetophenone using GladiATR with expanded range
Ge crystal plate.
16
Liquids, Solids and In-Between
Selection of the digital control module, PC control includes PIKE
TempPRO™ software for graphical setup and automated data collection
for thermal experiments.
GladiATR with 300 C heated diamond crystal plate and temperature
controller.
Specifications
O
Temperature controlled crystal plates are available for thermal
study of materials. The resistively heated diamond plate has a range
from ambient to 210 or 300 oC. PIKE Technologies offers temperature
controllers with digital and PC programmable set points with TempPRO
software, which allows for easily programmed temperature profile and
data collection by interfacing with most FTIR software platforms. For
sub-ambient studies, liquid jacketed plates are an option. The new
liquid jacketed/heated GladiATR diamond plate blends the benefits of
both resistively heated and liquid jacketed.
ATR Crystal Choices
Crystal Plate Mounting
User changeable plates
Crystal TypeMonolithic
Diamond MountingBrazed
Crystal Plate Mounts
Angle of Incidence
Stainless steel
45 degrees, nominal
Crystal Dimensions
(surface)
3.0 mm diameter
Optics
All reflective
Pressure DeviceRotating, continuously variable pressure;
click stop at maximum
Digital Force Adapter Load cell sensor for precise and reproducible
(option) pressure control. Attaches directly to
GladiATR clamp. Digital readout. For
ambient temperature measurements only.
Maximum Pressure
Sample Access
30,000 psi
80 mm, ATR crystal to pressure mount
Spectral Range, Diamond
4000 to 30 cm-1 (IR optics dependent)
Spectral Range, Ge
4000 to 450 cm-1 (IR optics dependent)
Heating Options
Accuracy
Sensor Type
ATR/FTIR spectra from cure of thermoset epoxy using the heated diamond
crystal plate on the GladiATR.
Diamond, 210 or 300 ºC maximum
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Temperature ControlDigital or digital with PC control (up to
20 ramps, automated data collection,
USB interface)
Input Voltage
210 °C version100–240 VAC, auto setting,
external power supply
300 °C version
110/220 VAC switchable
Operating Voltage 4A/24 VDC, 100 W
6A/24 VAC, 150 W (300 °C version)
Cooling Options
Specular Reflection
Option 17
Diamond, germanium
Purge Sealing
Accessory Dimensions (W x D x H)
FTIR Compatibility
Liquid jacketed crystal plates available
Optional, 45 degree nominal angle
of incidence
urge tubes and purge line connector
P
included
140 x 205 x 340 mm
(excludes FTIR baseplate and mount)
Most, specify model and type
O r d e r i n g I n fo r m a t i o n
G ladi ATR T emperature C ontrolled C rystal P lates
Part Number Description
Part Number Description
026-18XX GladiATR Single Reflection ATR Base Optics, with heating
capability up to 210 °C or 300 °C
026-4102 Heated Diamond Crystal Plate, 300 °C
026-4100 Heated Diamond Crystal Plate, 210 °C
026-4200
Liquid Jacketed/Heated Diamond Crystal Plate
026-4110 Liquid Jacketed Diamond Crystal Plate
026-4050 Heated Ge Crystal Plate, 130 °C
026-4150 Liquid Jacketed Ge Crystal Plate, 130 °C
Part Number Description
076-1220 Digital Temperature Control Module, 210 °C
026-2001
GladiATR Standard Stainless Top
076-1420 Digital Temperature Control Module, PC Control, 210 °C
026-2002
GladiATR Heated Stainless Top
076-1210
Digital Temperature Control Module, 300 °C
026-2003
GladiATR Liquid Jacketed Stainless Top
076-1410
Digital Temperature Control Module, PC Control, 300 °C
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
All GladiATRs include purge tubes, purge kit, and selected spectrometer base
mount. Crystal plates must be selected from the table below. High-Pressure Clamp,
Digital Force Adapter and Liquids Retainer/Volatiles Cover are optional and need to
be ordered separately, if required.
G ladi ATR S tainless T op (must select one or more)
Notes: Stainless top is not required for 300 °C version. For liquid jacketed/heated
plate (P/N 026-4200) order 026-2002.
C rystal P lates for G ladi ATR (must select one or more)
Notes: For heated diamond crystal plates, maximum crystal temperature is 300 or
210 °C. Ge becomes optically opaque at 150 °C; maximum recommended
temperature for this crystal is 130 °C. Temperature controller is required for heated
crystal plates. Digital temperature controller, PC control includes PIKE TempPRO
software. Liquid jacketed crystal plates require customer-provided circulator.
Part Number Description
026-2100
Diamond Crystal Plate
026-2050
Ge Crystal Plate
026-2200
Specular Reflection Plate
Notes: GladiATR crystal plates are pre-aligned and pinned-in-place. Changing crystal
plates is easy and fast to optimize sampling results. Plate housing is stainless steel;
contact us for Hastelloy options. Reconditioning service is available.
P ressure C lamp for G ladi ATR, all models (must select for
solid or powdered samples)
Part Number Description
026-3020
High-Pressure Clamp
076-6026
Digital Force Adapter for High-Pressure Clamp
Part Number Description
025-3095
Flat Tip for High-Pressure Clamp
025-3093
Swivel Tip for High-Pressure Clamp
025-3092
Concave Tip for High-Pressure Clamp
025-3099
High-Pressure Tip Assortment
026-5012
Flow-Through Attachment, 210 °C, 100 µL
026-5014
Flow-Through Attachment, 300 °C, 100 µL
026-5013
Liquids Retainer and Volatiles Cover Set
026-3051 Volatiles Cover
026-5015
Liquids Retainer and Volatiles Cover Set, 300 °C
026-5010 Liquids Retainer, 260 °C
Note: Flow-Through Attachment and Liquids Retainer are compatible
with all crystal offerings (require High-Pressure Clamp).
Pike Technologies
Notes: The High-Pressure Clamp is required for analysis of solids, powders and use
of Liquids Retainer, Flow-Through Attachment and/or Digital Force Adapter (Digital
Force Adapter may be used when measuring samples at ambient temperature only).
Pressure clamp includes a flat tip, a swivel tip and a concave tip.
G ladi ATR S ampling O ptions
A t tenuated T otal R eflectance
G ladi ATR B ase O ptics (must select)
www.piketech.com
608-274-2721
18
Liquids, Solids and In-Between
GladiATR Vision –
Diamond ATR with Sample View
The GladiATR Vision accessory utilizes an innovative optical
design with IR beam and visible optical image converging at the
sample position – ensuring that “What you see is what you sample!” The 110X magnification of the sample image enables the positioning
of even relatively small samples into the center of the diamond
crystal for optimized analysis. Analysis of samples as small as
50 microns in size is doable with the GladiATR Vision accessory.
Visible images from the GladiATR Vision are of highest quality
color rendition because its refractive optics are fully transparent.
The GladiATR Vision optical design is all reflective, preserving
the full spectral range inherent to diamond. For standard mid-IR
FTIR spectrometers, the spectral range available with the GladiATR
Vision will be 4000–400 cm-1. For FTIR spectrometers equipped with
far-IR optics, the spectral range is extended to less than 50 cm-1.
Features
• View through diamond crystal – easily find sample point
• 110X magnification – find and position small sample areas
• USB image capture – document sample image
• Diamond crystal design – scratch and fracture resistant
• Highest energy throughput design – for excellent quality
ATR spectrum of print area on paper run on GladiATR Vision with
diamond crystal. Image of the analysis area is shown in the inset.
Spectral range is 4000–400 cm-1 with standard FTIR optics.
FTIR spectra and minimum scan time
• All reflective optics – full spectral range for mid-IR and
far-IR analysis
• Optional heated, viewing crystal plate
The GladiATR Vision™ is a novel sampling tool which couples
small area infrared analysis with simultaneous viewing. Samples
are placed face down and positioned on the diamond crystal
while its image is projected in real-time on the LCD screen. Finding
and optimizing the sample placement for specific analysis areas is
easy and fast! Analysis of thick or non-transparent samples is no
problem because viewing is through the diamond crystal.
ATR spectrum of 200-micron fiber run on GladiATR Vision with
diamond crystal. Compressed fiber image is shown with the spectrum.
Diamond crystal plate of the GladiATR Vision accessory. IR beam and
visible illumination meet at the sample position.
19
Specifications
026-2004
GladiATR Vision Stainless Top
026-2005
GladiATR Vision Heated Stainless Top
026-2006
GladiATR Vision Liquid Jacketed Stainless Top
GladiATR Vision Diamond Crystal Plate
Ge Crystal Plate (non-viewing)
026-2202
Specular Reflection Plate (viewing)
026-2200
Specular Reflection Plate (non-viewing)
Diamond MountingBrazed
Crystal Dimensions
(surface)
3.0 mm diameter
Optics
Stainless steel
All reflective
Pressure DeviceRotating, continuously variable pressure;
click stop at maximum
Digital Force Adapter
(option) Maximum Pressure
Sample Access
Load cell sensor for precise and
reproducible pressure control. Attaches
directly to GladiATR clamp. Digital readout.
For ambient temperature measurements
only.
30,000 psi
80 mm, ATR crystal to pressure mount
4000 to 30 cm-1 (IR optics dependent)
Viewing Optics
Integrated 4” LCD
Magnification
View Area
110X magnification
Notes: GladiATR Crystal Plates are pinned-in-place. Changing crystal plates is easy
and fast to optimize sampling results. Only the GladiATR Vision Diamond Crystal Plate
and viewing specular reflectance are compatible with sample viewing.
H igh -P ressure C lamp for G ladi ATR V ision
(must select for solid or powdered samples)
Part Number Description
026-3020
High-Pressure Clamp
076-6026
Digital Force Adapter for High-Pressure Clamp
Notes: The High-Pressure Clamp is required for analysis of solids, powders and for
use of liquids retainer and/or Digital Force Adapter (Digital Force Adapter may be
used with samples at ambient temperature only). Pressure clamp includes a flat tip,
a swivel tip and a concave tip.
G ladi ATR V ision T emperature C ontrolled C rystal P late
Part Number Description
770 x 590 microns
026-4101 Heated Diamond Crystal Plate, 210 °C (viewing)
Optional Image SaveUSB image capture
026-4050 Heated Ge Crystal Plate, 130 °C (non-viewing)
026-4112
Liquid Jacketed Diamond Crystal Plate, 210 °C max (viewing)
076-1220 Digital Temperature Control Module
076-1420 Digital Temperature Control Module, PC Control
Viewing Mode
Input Voltage100–240 V, auto setting, external
power supply
Through diamond crystal
Operating Voltage, Wattage
12 VDC, 18 W maximum
Heating Options Diamond, 210 ºC maximum
Accuracy
Sensor Type
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Temperature ControlDigital or digital with PC control (up to
20 ramps, automated data collection,
USB interface)
Input Voltage100–240 VAC, auto setting, external
power supply
Operating Voltage Specular Reflection
Option
Part Number Description
026-5012
Flow-Through Attachment, 100 µL
4A/24 VDC 100 W
026-5013
Liquids Retainer and Volatiles Cover Set
Viewing, 45 degree nominal angle
of incidence
026-3051 Volatiles Cover
026-5010 Liquids Retainer
Purge SealingPurge tubes and purge line connector
included
Accessory Dimensions 140 x 225 x 340 mm
(W x D x H)(excludes FTIR baseplate and mount)
Most, specify model and type
Note: Flow-Through Attachment and Liquids Retainer are compatible with all
crystal offerings (High-Pressure Clamp required).
608-274-2721
FTIR Compatibility
G ladi ATR V ision S ampling O ptions
www.piketech.com
Notes: For heated diamond crystal plates, maximum crystal temperature is 210 °C.
Ge becomes optically opaque at 190 °C. Maximum recommended temperature for
this crystal is 130 °C. Temperature controller is required for heated crystal plates.
Digital temperature controller, PC control includes PIKE TempPRO software. Liquid
jacketed crystal plates require customer-provided circulator.
Pike Technologies
Spectral Range, Diamond
Part Number Description
026-2050
45 degrees, nominal
G ladi ATR S tainless T op (must select one or more)
026-2102
Angle of Incidence
GladiATR Vision Base Optics
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
GladiATR Vision Base Optics versions include purge tubes, illumination power supply,
purge kit and spectrometer base mount. USB interface software included enables
image capture on your PC.
User changeable plates
Crystal TypeMonolithic
026-19XX
Part Number Description
Crystal Plate Mounts
Part Number Description
Diamond, germanium (non-viewing)
G ladi ATR V ision B ase O ptics (must select one)
C rystal P lates for G ladi ATR V ision (must select one or more)
ATR Crystal Choices
Crystal Plate Mounting
O r d e r i n g I n fo r m a t i o n
A t tenuated T otal R eflectance
Temperature controlled crystal plates are available for thermal
study of materials. The resistively heated diamond Vision plate has
a temperature range from ambient to 210 oC. PIKE Technologies
offers temperature controllers with digital and PC programmable set
points with TempPRO software, which allows for easily programmed
temperature profiles and data collection by interfacing with most FTIR
software platforms. For applications requiring temperatures from subambient to 210 oC, liquid jacketed plates are available.
The viewing specular reflection plate transforms the GladiATR
Vision into a 45 degree specular reflection accessory, uniquely
allowing the sampling spot, such as a defect, to be easily located.
With the small spot size of 3 mm, you can be confident of your
sampling point.
The GladiATR Vision diamond ATR is available in configurations to
fit most FTIR spectrometers.
20
Liquids, Solids and In-Between
Dedicated GladiATR and GladiATR Vision Sampling Tools –
More Options to Address Your Specific Application Requirements
Extended Range Ge Crystal Plate
Flow-Through Attachment
Due to the compact crystal size and the all reflective optics of the
GladiATR platform, the Ge Crystal Plate offers an extended spectral
range from 4000–450 cm-1. A Ge ATR crystal is used to measure
samples with a high refractive index. Types of high refractive
materials that would benefit from sampling on the extended
range Ge ATR crystal are carbon black filled samples and inorganic
materials such as oxides, aluminas, titania, and minerals. The
Ge crystal plate (non-viewing) may be fitted to the GladiATR or
GladiATR Vision. Crystal plates are easily interchangeable. A heated
version is available.
The Flow-Through Attachment is used for continuous monitoring
or handling samples that pose a hazard from ambient exposure.
Samples are introduced using the Luer-Lok fitting by connecting a
syringe or a flow line. 1/16 inch compression fittings are optional.
The High-Pressure Clamp is required.
Flow-Through
Attachment
Spectrum of malachite
green oxalate collected
using the GladiATR with
Ge crystal plate
Liquids Retainer and Volatiles Cover
The Liquids Retainer offers a trough configuration for GladiATR
and GladiATR Vision. The volatiles cover reduces the amount of
evaporation of a highly volatile liquid sample placed on the surface
of the crystal. The High-Pressure Clamp is required.
Specular Reflection Plate
The GladiATR may be converted from an ATR accessory to a
specular reflection accessory by using the Specular Reflection
Plate. A viewing Specular Reflection Plate is available for the
GladiATR Vision. The angle of incidence is 45 degrees, and plate
is easily interchangeable with ATR plates.
GladiATR Specular
Reflection Plate
Liquids Retainer
and Volatiles
Cover Set
O r d e r i n g I n fo r m a t i o n
G ladi ATR O ptions
Part Number Description
Temperature Control
The GladiATR and GladiATR Vision can be fitted for temperature
control by configuring the accessory with a liquid jacketed or
resistively heated diamond or Ge plate. When coupled with the
PC temperature controller, up to 20 temperature ramps are easily
programmed using PIKE TempPRO, which also interfaces with many
FTIR software packages for data collection as a function of time or
temperature.
Heated GladiATR
with temperature
control module
026-2050
Ge Crystal Plate (non-viewing)
026-4050
Heated Ge Crystal Plate, 130 °C (non-viewing)
026-4100
Heated Diamond Crystal Plate, 210 °C (non-viewing)
026-4101
Heated Diamond Crystal Plate, 210 °C (viewing)
026-4102
Heated Diamond Crystal Plate, 300 °C (non-viewing)
076-1220
Digital Temperature Control Module
076-1420
Digital Temperature Control Module, PC control
026-4110
Liquid Jacketed Diamond Crystal Plate (non-viewing)
026-4112
Liquid Jacketed Diamond Crystal Plate, 210 °C max (viewing)
026-2200
Specular Reflection Plate (non-viewing)
026-2202
Specular Reflection Plate (viewing)
026-5012
Flow-Through Attachment, 210 °C, 100 µL
026-5014
Flow-Through Attachment, 300 °C, 100 µL
026-5013 Liquids Retainer and Volatiles Cover Set
026-5010
Liquids Retainer
026-3051
Volatiles Cover
026-5015 Liquids Retainer and Volatiles Cover Set, 300 °C
Notes: The heated crystal plates require a temperature control module and
appropriate stainless steel top. For more heated options, please review the GladiATR
and GladiATR Vision accessory product data sheets.
21
HATR Accessory –
in-compartment
HATR for liquid
and solid
samples
HATRPlus™ Accessory –
out-of-compartment
HATR for liquid
and extra large
solid samples
Horizontal Attenuated Total Reflectance (HATR) accessories
successfully replace constant path transmission cells, salt plates
and KBr pellets used in the analysis of liquid, semi-liquid materials
and a number of solids. HATRs feature a constant and reproducible
effective pathlength and are well suited for both qualitative and
quantitative applications. In general, sampling is achieved by
placing the sample onto the HATR crystal – generally eliminating
sample preparation.
The PIKE Technologies HATR accessory provides high sensitivity
for analysis of low concentration components in liquid, solid, and
polymer samples. To optimize spectral measurements a selection
of crystal materials, sample formats, and temperature and flowthrough configurations are available.
PIKE Technologies HATR products are available in two base
optic configurations. The HATR is an in-compartment design
for samples which fit into the FTIR sample compartment. The
HATRPlus is an out-of-compartment design for samples which
are larger and do not fit into the FTIR sample compartment. The
sampling surface of the HATRPlus extends above the FTIR cover,
thereby permitting analysis of very large samples. Applications
examples include coatings on large manufactured components,
layered composition analysis on large objects, and skin analysis in
the health care industry.
• Excellent energy throughput offering high signal-to-noise
ratio and spectral quality
• Up to 20 internal reflections on the sample for maximum
sensitivity for low concentration components
precision and quick cleanup
• HATR plates with ZnSe, KRS-5, Ge, AMTIR or Si crystals with
selectable face angles to optimize sampling depth
• In-compartment (HATR) and out-of-compartment
(HATRPlus) versions for small and extra large sample sizes
• Several temperature controlled and flow-through
crystal options
608-274-2721
The PIKE Technologies HATRs are high-performance accessories,
carefully designed to provide excellent results with minimum effort.
Accessories are easily installed in the sample compartment, locking
into position on the sample compartment baseplate.
Stable alignment provides excellent analytical precision.
Crystal plate changeover is rapid, allowing a wide range of samples
to be analyzed with maximum convenience. PIKE Technologies
HATRs have been optimized for maximum optical throughput and
excellent quality spectra can be obtained from demanding samples.
Several high-quality crystal materials covering a full spectrum of
applications are available. Trough and sealed flat crystal plates are
sealed using metallic gaskets, eliminating premature failure and the
risk of cross-contamination associated with inferior, epoxy-bonded
systems. Flat crystal plates are designed with positive surface
relief to aid in improved sample contact.
All PIKE HATRs include a purge tube interface for the FTIR
spectrometer. This provides full integration of the accessory with
the FTIR spectrometer’s purging system (sealed and desiccated or
purged) and removal of water and carbon dioxide artifacts from
the FTIR spectra. Thanks to this, purging is very efficient and the
spectrometer can be operated with the sample compartment
door open.
www.piketech.com
• Removable crystal plates with pinned positioning for high
FTIR spectrum of fuel additive using HATR trough plate with
ZnSe crystal.
Pike Technologies
Features
A t tenuated T otal R eflectance
Multiple Reflection HATR –
Maximum Sensitivity and Highly Versatile FTIR Sampling
22
Liquids, Solids and In-Between
HATR Crystal Plate Choices
PIKE Technologies HATR crystal plates are available in trough, flat
plate and flow cell configurations.
The flat plate is used for the analysis of solid materials –
including polymer and film samples. It is ideal for solid samples
which are too large to fit within the trough plate configuration. The
crystal is mounted slightly above the surface of the metal plate,
which helps to achieve good crystal/sample contact when the flat
plate press is used.
The ZnSe and Ge 45 degree flat plates are available in a sealed
version, which is ideal for sampling of oils and other types of low
surface tension liquids.
Ge Flat Plate
Flat plate HATR crystal plate – ideal for solids, polymer films and coatings.
ZnSe Sealed Flat Plate
ZnSe Trough Plate
KRS-5 Trough Plate
RCPlate
The trough plate is designed for easy sampling, with a large,
recessed crystal to accommodate the sample – generally a liquid,
powder, or paste. The trough plate is ideal when samples must
be cleaned from the crystal with some type of aqueous or
organic solvent.
Typically, only a thin layer of the sample needs to be applied
onto the crystal surface. For fast evaporating samples, a volatiles
cover should be used to cover the sampling area.
Soft powders will often produce good spectra when analyzed
by HATR, assuming that they can be put in intimate contact with
the crystal. A powder press option is used to achieve this. This
device is placed directly on top of the sample filled trough and
pressed by hand until the desired result is obtained.
Trough plate HATR crystal plate – ideal for liquids, powders, pastes and gels.
RCPlate™
For special applications where you need to look at coatings on
an HATR crystal, PIKE Technologies offers the RCPlate option. The
RCPlate is designed to enable easy removal and reinsertion of the
HATR crystal. Applications include analysis of coatings, monomolecular layers, or bio-films deposited directly upon the HATR
crystal. With these new RCPlates, it is easy to collect the background
spectrum on the clean crystal, remove the HATR crystal from the
RCPlate, coat the crystal and then reposition it into the RCPlate to
collect the sample spectrum.
Flow-Through Cell
Heated UV HATR
Flow-Through Cell
23
Flow-through cells are a versatile option for the dynamic
laboratory. The ATR crystal is sealed in with O-rings, which allows
for user-changeable crystals. The sample may be introduced by
syringe or through tubing connected to a 1/16 inch compression
fitting. Flow-through cells may be configured for temperature
control with Teflon coating.
In addition to our standard flow-through cells, PIKE offers a
flow-through cell with a quartz window for photocatalytic studies.
Due to degradation of ZnSe in the presence of UV exposure, we
recommend using an AMTIR crystal.
All resistively heated HATR plates and flow-through cells are
controlled by PIKE temperature controllers in digital or digital PC
versions. The selection of the digital PC version includes PIKE TempPRO
software, which provides a graphical user interface for temperature
control and kinetic measurements.
A large number of flat, trough and flow-through sampling plates
are available for PIKE Technologies HATRs – all are pin-mounted
to the HATR with no alignment required. They are compatible and
interchangeable with HATR and HATRPlus products which allows
optimizing the accessory’s configuration for best spectral results.
Do you need an HATR product or feature not shown here in
our catalog? Please contact us to discuss your application.
PIKE TempPRO Software for kinetic experiments with our Resistively
Heated Crystal Plates.
Specifications
Temperature Range
Ambient to 130 °C
Accuracy
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Sensor Type
Controllers
Digital
+/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Input Voltage
100–240 VDC, auto setting,
external power supply
Output Voltage
24 VDC/50 W maximum
HATR Crystals
Crystal Dimensions
A t tenuated T otal R eflectance
HATR with Heated Trough Plate and temperature control module –
foreground shows Heated Flow-Through Cell.
ZnSe, Si, Ge, AMTIR and KRS-5
80 x 10 x 4 mm or 80 x 10 x 2 mm
Number of Reflections
10 for 45 degree, 4-mm thick
on the Sample20 for 45 degree, 2-mm thick
5 for 60 degree, 4-mm thick
Base Dimensions115 x 55 x 70-104 mm (excludes
(W x D x H)
baseplate and purge collars; base height depends on the beam height of the spectrometer)
Pike Technologies
HATR with Flow-Through Cell (background). Liquid Jacketed Trough
Plate is shown in foreground.
www.piketech.com
608-274-2721
24
Liquids, Solids and In-Between
O r d e r i n g I n fo r m a t i o n
Complete HATR Systems
B undled HATR S ystems ( insert spectrometer model for XX)
Part Number Description
022-10XX
HATR Trough Plate System with 45º ZnSe Crystal
Includes Trough Plate, Volatiles Cover and Powder Press
022-11XX
HATR Flat Plate System with 45º ZnSe Crystal
Includes Flat Plate and HATR Pressure Clamp
022-12XX
HATR Combined Trough and Flat Plate System
with 45º ZnSe Crystals
Includes Trough Plate, Flat Plate, Volatiles Cover, Powder
Press and Sample Clamp
024-11XX
HATRPlus Flat Plate System with 45º ZnSe Crystal
Includes Flat Plate and HATR Pressure Clamp
P ressure C lamp for HATR and HATRP lus
( must select for solids, films or powder analysis)
Part Number Description
022-3050
HATR (pivoting) Pressure Clamp
022-3054
HATR High-Pressure Clamp
024-3050
HATRPlus (pivoting) Pressure Clamp
024-3053
HATRPlus High-Pressure Clamp
Notes: The pressure clamp is required for solids, films, coatings and powdered
samples. Maximum force for (pivoting) Pressure Clamp and High-Pressure Clamp is
13 lbs and 30 lbs, respectively.
C rystal P lates for HATR and HATRP lus
(must select 1 or more)
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
HATR and HATRPlus systems may be purchased with crystal plates other than ZnSe.
Just add –Ge for germanium, –KR for KRS-5, –AM for AMTIR, or –Si for silicon to
the part number. Additional plates can be added to an order for any system above.
Other configurations may be selected from the options below.
Part Number Description
022-2010-45 Trough Plate, ZnSe, 45°
022-2020-45 Flat Plate, ZnSe, 45°
022-2024-45 Sealed Flat Plate, ZnSe, 45°
Configurable HATR Systems
022-2012-45 Trough Plate, ZnSe, 45°, 2 mm
022-2022-45 Flat Plate, ZnSe, 45°, 2 mm
022-2030-45 Trough Plate, KRS-5, 45°
022-2040-45 Flat Plate, KRS-5, 45°
022-2050-45 Trough Plate, Ge, 45°
022-2060-45 Flat Plate, Ge, 45°
022-2064-45 Sealed Flat Plate, Ge, 45°
022-2052-45 Trough Plate, Ge, 45°, 2 mm
022-2062-45 Flat Plate, Ge, 45°, 2 mm
022-2070-45 Trough Plate, AMTIR, 45°
022-2080-45 Flat Plate, AMTIR, 45°
022-2090-45 Trough Plate, Si, 45°
022-2100-45 Flat Plate, Si, 45°
HATR B ase O ptics
Part Number Description
022-19XX
HATR Platform Optics Assembly
024-19XX
HATRPlus Platform Optics Assembly
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
HATR and HATRPlus Platform Optics Assemblies include volatiles cover, powder
press, purge tubes, purge kit and spectrometer base mount.
Notes: HATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystal
plates is easy and fast to optimize sampling results. For most HATR crystal plates,
60 degree face angle is also available. Where not noted, crystals are 4-mm thick
and generate 10 reflections on the sample (45° cut). 2-mm crystals result in
20 reflections (45° cut). If you need a crystal not listed here, please contact us.
Reconditioning service is available.
25
O r d e r i n g I n fo r m a t i o n
P art N umber Description
022-5110
HATR Heated Trough Plate, ZnSe, 45°
022-5120
HATR Heated Trough Plate, AMTIR, 45°
022-5130
HATR Heated Trough Plate, KRS-5, 45°
022-5140
HATR Heated Trough Plate, Si, 45°
022-5150
HATR Heated Trough Plate, Ge, 45°
Part Number
Description
022-5210
HATR Heated Flow-Through Cell, ZnSe, 45°
022-5212
HATR Heated Flow-Through Cell, ZnSe, 45°, 2 mm
022-5220
HATR Heated Flow-Through Cell, AMTIR, 45°
022-5230
HATR Heated Flow-Through Cell, KRS-5, 45°
L iquid J acketed , F low -T hrough C rystal P lates for
HATR and HATRP lus
Part Number
Description
022-5410
HATR Liquid Jacketed Flow-Through Plate, ZnSe, 45°
022-5412
HATR Liquid Jacketed Flow-Through Plate, ZnSe, 45°, 2mm
022-5420
HATR Liquid Jacketed Flow-Through Plate, AMTIR, 45°
022-5430
HATR Liquid Jacketed Flow-Through Plate, KRS-5, 45°
022-5440
HATR Liquid Jacketed Flow-Through Plate, Si, 45°
022-5450
HATR Liquid Jacketed Flow-Through Plate, Ge, 45°
022-5452
HATR Liquid Jacketed Flow-Through Plate, Ge, 45°, 2 mm
Notes: Liquid jacketed flow-through crystal plates require customer-provided
liquid circulator to enable heating to 130 °C and cooling. HATR flow cells include
Luer-Lok fittings for easy connection with a syringe and 1/16” Swagelok® fittings for
connection with 1/16” tubing. PTFE-coated flow-through cells available – contact us
for more information.
022-5240
HATR Heated Flow-Through Cell, Si, 45°
022-5250
HATR Heated Flow-Through Cell, Ge, 45°
HATR RCP late
022-5252
HATR Heated Flow-Through Cell, Ge, 45°, 2 mm
Part Number Description
022-5225
HATR Heated Flow-Through Cell with UV Port, AMTIR, 45°
022-2300
RCPlate for HATR (for 45° crystals)
Note: Requires a selection of HATR Crystal – see below
Part Number Description
076-1420
Digital Temperature Control Module, PC Control
HATR and HATRP lus R eplacement P arts
076-1220
Digital Temperature Control Module
Part Number Description
022-3051
HATR Volatiles Cover
022-3052
HATR Powder Press
160-5554
Crystal, Trap, ZnSe, 45°, 80 x 10 x 4 mm
160-5559
Crystal, Trap, ZnSe, 45°, 80 x 10 x 2 mm
160-5555
Crystal, Trap, KRS-5, 45°, 80 x 10 x 4 mm
Crystal, Trap, Ge, 45°, 80 x 10 x 4 mm
Notes: Temperature is adjustable to 130 °C for heated trough plates and flowthrough cells. Ge becomes opaque near 100 °C. Resistance heated plates require
selection of a PIKE Technologies Temperature Control Module. PC Control Module
includes PIKE Technologies TempPRO software. PTFE-coated flow-through cells
available – contact us for more information.
F low -T hrough C ells for HATR and HATRP lus
022-4010
HATR Flow-Through Cell, ZnSe, 45°
160-5560
Crystal, Trap, Ge, 45°, 80 x 10 x 2 mm
022-4012
HATR Flow-Through Cell, ZnSe, 45°, 2 mm
160-5557
Crystal, Trap, AMTIR, 45°, 80 x 10 x 4 mm
022-4020
HATR Flow-Through Cell, AMTIR, 45°
160-5558
Crystal, Trap, Si, 45°, 80 x 10 x 4 mm
022-4030
HATR Flow-Through Cell, KRS-5, 45°
160-5561
Crystal, Trap, ZnSe, 60°, 80 x 10 x 4 mm
022-4040
HATR Flow-Through Cell, Si, 45°
160-5562
Crystal, Trap, Ge, 60°, 80 x 10 x 4 mm
022-4050
HATR Flow-Through Cell, Ge, 45°
022-3032
Spacer for HATR Flow Cell, 2 mm
022-4052
HATR Flow-Through Cell, Ge, 45°, 2 mm
022-3040
Viton O-Ring for HATR Flow-Through Cell, upper (6 ea.)
HATR Flow-Through Cell with UV Port, AMTIR, 45°
022-3045
Viton O-Ring for HATR Flow-Through Cell, lower (6 ea.)
022-3041 Perfluoroelastomer O-Ring for HATR Flow-Through Cell,
upper (1 ea.)
022-3046 Perfluoroelastomer O-Ring for HATR Flow-Through Cell,
lower (1 ea.)
022-5228
Notes: HATR flow-through cells include Luer-Lok fittings for easy connection with
a syringe. A set of 1/16” Swagelok fittings are also included with each flow-through
cell for connection with 1/16” tubing. Flow-through cell volume is 500 µL. PTFEcoated flow-through cells available – contact us for more information.
L iquid J acketed C rystal P lates for HATR and HATRP lus
Description
022-5310
HATR Liquid Jacketed Trough Plate, ZnSe, 45°
022-5320
HATR Liquid Jacketed Trough Plate, AMTIR, 45°
022-5330
HATR Liquid Jacketed Trough Plate, KRS-5, 45°
022-5340
HATR Liquid Jacketed Trough Plate, Si, 45°
022-5350
HATR Liquid Jacketed Trough Plate, Ge, 45°
Notes: Liquid jacketed crystal plates require customer-provided liquid circulator.
Liquid jacketed crystal plates enable heating to 130 °C and cooling. Ge becomes
opaque near 100 °C.
608-274-2721
Part Number
Notes: Reconditioning service for used HATR crystal plates is available. Contact PIKE
Technologies for items not described in this list.
www.piketech.com
Description
Pike Technologies
Part Number
160-5556
A t tenuated T otal R eflectance
H eated C rystal P lates for HATR and HATRP lus
26
Liquids, Solids and In-Between
ATRMax II Variable Angle Horizontal ATR Accessory –
HATR for Inquisitive Minds
The ATRMax II is a high throughput, variable angle horizontal ATR
accessory developed for use in FTIR spectrometers. The design
employs a unique optical layout (U.S. patent 5,105,196) which
enables samples to be analyzed over a range of incident angles from
25 to 65 degrees. Variable angle of incidence provides experimental
control over the depth of penetration of an IR beam into the sample
and the number of beam reflections in the ATR crystal, which in turn
determines the effective IR beam pathlength for a given experiment.
Adjustable angle of incidence allows immediate optimization of
measurements for otherwise difficult to analyze samples. The
ATRMax can be used for depth profiling studies where spectral
composition may be analyzed relative to depth of penetration as the
angle of incidence is changed.
Features
• Selectable angle of incidence – 25 to 65 degrees in one
degree increments
• 0.5 to 10 micron depth of penetration – dependent on
crystal material, angle of incidence, sample’s refractive
index and wavelength of IR beam – ideal for depth
profiling studies
Proprietary beam path within the ATRMax II FTIR sampling accessory.
• 3 to 12 reflections of IR beam – dependent upon angle of
incidence – ideal for optimizing ATR sampling methods
• Flat and trough crystal plates for solids, films, powders
and liquid samples – optional temperature control for
all plates
• Optional, high-pressure clamp for sampling of films,
coatings or powdered samples
• Motorized option with electronic control module and
AutoPRO™ software for automated, high-precision
experiments
• Sealed and purgeable optical design to eliminate water
vapor and carbon dioxide interferences
Depth profiling study of silicon release agent using ATRMax II accessory.
FTIR spectra collected using Ge crystal flat plates at effective angles of
incidence from 25 to 65 degrees.
The ATR crystals for the ATRMax II are of trapezoidal shape and
56-mm long, 10-mm wide and 4-mm thick. Standard bevel angles
at each end of the crystal are available in 30, 45, and 60 degree
versions. Coupling the variable angle of incidence of the ATRMax II
with the variable crystal face angles, one can select effective angle of
incidence ranging from 25 to 65 degrees and the range in number of
reflections from 3 to 12.
27
Optimized FTIR spectrum of polymer film run with the ATRMax II at
60 degree angle of incidence.
A variety of flow-through cells are available which feature
removable crystals. This enables replacement of the crystals and
facilitates cleaning of “sticky” samples. Flow cells may be configured
for ambient measurements and heating and liquid jacketed
temperature control. With the liquid-jacketed version one can
measure samples at heated
or cooled temperatures
using a liquid circulator.
PTFE coating of the cell
is an option.
Optional resistively heated crystal plates are available for
the ATRMax II trough, flat and flow-through cell versions. These
heated crystal plates are driven using PIKE Technologies temperature
controllers available in digital and digital PC versions. The digital
PC version offers PIKE TempPRO software for graphical setup and
interfaces with most FTIR software packages for data collection.
The trough crystal plate is recommended for use with liquids,
pastes and powdered samples. Typical applications include the
analysis of oils, detergents, and other liquid samples. A volatiles
cover and powder press are included with the ATRMax II for use
with this crystal mount.
• Computer controlled precision, accuracy and repeatability
For special applications where you need to look at coatings
on an ATR crystal, PIKE Technologies offers the RCPlate™ option.
The RCPlate is designed to enable easy removal and reinsertion of
the ATR crystal. Applications include analysis of coatings, monomolecular layers, or bio-films deposited directly upon the ATR
crystal. With these RCPlates, it is easy to collect the background
spectrum on the clean crystal, remove the ATR crystal from the
RCPlate, coat the crystal and then reposition it into the RCPlate to
collect the sample spectrum.
• Full integration of the PIKE Technologies AutoPRO software with
most FTIR spectrometer programs
• Synchronization of mirror position changes with collection of
sample spectra
• Tailor-made, predefined experiments
• “Hands-free” operation
608-274-2721
AutoPRO Software
control of ATRMax
angle of incidence
(automated polarizer
available) for
automated depth
profiling studies
and ATR experiment
optimization.
www.piketech.com
Liquid cough syrup sample spectrum collected with the ATRMax II
accessory using the ZnSe trough plate and a 40 degree angle of incidence.
Pike Technologies
The variable angle of incidence can be controlled manually
or with an optional motorized attachment for the ATRMax II.
Multiple ATR measurements at different angles of incidence can
be fully automated with the motorized version and PIKE Technologies
AutoPRO software. Automation streamlines the collection of spectra
from multiple angles of incidence. With the automated ATRMax
accessory, the entire experiment can be pre-programmed and
executed by the computer. Advantages of the automated ATRMax II
system include:
A t tenuated T otal R eflectance
Two crystal plate configurations, flat and trough, are available
for the ATRMax II. The flat crystal plate design is used for the
analysis of coatings, films and non-particulate solids. Typical
applications include depth profiling studies and optimization of
ATR spectral data. A sample clamp is required to provide intimate
contact between the sample and crystal surface.
28
Liquids, Solids and In-Between
O r d e r i n g I n fo r m a t i o n
ATRM ax II S ystem C onfigurations
ATRM ax II S ampling O ptions
Part Number D e s c r i p t i o n
Part Number D e s c r i p t i o n
023-10XX
ATRMax II Trough Plate System with 45º ZnSe Crystal
Includes Trough Plate, Volatiles Cover and Powder Press
023-2800
Motorized Upgrade for ATRMax II
023-2850
Motorized Option for ATRMax II
023-11XX
ATRMax II Flat Plate System with 45º ZnSe Crystal
Includes Flat Plate and Pressure Clamp
090-1000
Manual Polarizer, ZnSe
023-12XX
ATRMax II Combined Trough and Flat Plate System
with 45º ZnSe Crystals
Includes Trough Plate, Flat Plate, Volatiles Cover, Powder
Press and Pressure Clamp
090-5000
Precision Automated Polarizer, ZnSe, USB
023-2300
RCPlate for ATRMax II
023-4000
ATRMax Flow Cell Assembly (order crystal separately)
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
ATRMax II Systems may be purchased with crystal plates other than ZnSe.
Just add -Ge for germanium, -KR for KRS-5, -AM for AMTIR, or -Si for Silicon.
Additional plates can be added to an order for any system above. Other configurations
may be selected from the options below.
ATRM ax II B ase O ptics (must select)
Part Number
Description
023-19XX
ATRMax II Variable Angle HATR
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
ATRMax II Base Optics includes volatiles cover, powder press, purge tubes,
purge kit and spectrometer base mount.
C rystal P lates for ATRM ax II (must select 1 or more)
Part Number D e s c r i p t i o n 023-4100ATRMax Liquid-Jacketed Flow-Through Cell Assembly
(order crystal separately)
023-4200
ATRMax Heated Flow-Through Cell Assembly
(order crystal separately)
023-4300
ATRMax Heated Trough Plate Assembly (order crystal separately)
023-4400
ATRMax Heated Flat Plate Assembly (order crystal separately)
013-4200
ATR Variable Angle Heating Conversion Plate
076-1420
Digital Temperature Control Module, PC Control
076-1220
Digital Temperature Control Module
Notes: Motorized Option includes PIKE Technologies AutoPRO software and controller.
Other polarizer options are found in the polarization section of this catalog. The
ATR Variable Angle Heating Conversion Plate must be selected with temperature
controlled crystal plates. Resistively heated crystal plates require selection of the
Temperature Control Module. Maximum crystal temperature is 120 °C.
023-2001
Trough Plate, ZnSe, 45°
023-2011
Flat Plate, ZnSe, 45°
C rystals for ATRM ax II
023-2021
Trough Plate, ZnSe, 30°
Part Number D e s c r i p t i o n
023-2031
Flat Plate, ZnSe, 30°
023-2041
Trough Plate, ZnSe, 60°
023-2051
Flat Plate, ZnSe, 60°
023-2003
Trough Plate, Ge, 45°
023-2013
Flat Plate, Ge, 45°
023-2023
Trough Plate, Ge, 30°
023-2033
Flat Plate, Ge, 30°
023-2043
Trough Plate, Ge, 60°
023-2053
Flat Plate, Ge, 60°
023-2046
Trough Plate, AMTIR, 45°
160-5563
Crystal, 45°, Trap., 56 x 10 x 4, ZnSe
160-5571
Crystal, 60°, Trap., 56 x 10 x 4, ZnSe
160-5569
Crystal, 30°, Trap., 56 x 10 x 4, Ge
160-5565
Crystal, 45°, Trap., 56 x 10 x 4, Ge
160-5573
Crystal, 60°, Trap., 56 x 10 x 4, Ge
160-5570
Crystal, 30°, Trap., 56 x 10 x 4, Si
160-5567
Crystal, 45°, Trap., 56 x 10 x 4, Si
160-5575
Crystal, 60°, Trap., 56 x 10 x 4, Si
160-5566
Crystal, 45°, Trap., 56 x 10 x 4, AMTIR
160-5574
Crystal, 60°, Trap., 56 x 10 x 4, AMTIR
Note: Please contact PIKE Technologies for crystals not on this list.
023-2047
Flat Plate, AMTIR, 45°
023-2002
Trough Plate, KRS-5, 45°
ATRM ax II R eplacement P arts
023-2012
Flat Plate, KRS-5, 45°
Part Number D e s c r i p t i o n
023-2022
Trough Plate, KRS-5, 30°
023-3051
ATRMax II Volatiles Cover
Flat Plate, KRS-5, 30°
023-3052
ATRMax II Powder Press
023-2032
023-2042
Trough Plate, KRS-5, 60°
023-2052
Flat Plate, KRS-5, 60°
023-2044
Trough Plate, Si, 45°
023-2045
Flat Plate, Si, 45°
Notes: ATRMax crystal plates are pre-aligned and pinned-in-place. Changing crystal
plates is easy and fast to optimize sampling results. If you need a crystal plate not
listed here, please contact us.
P ressure C lamp for ATRM ax II
Part Number Description
023-3050
ATRMax Pressure Clamp
Note: The pressure clamp is required for solids, films, coatings and powdered samples.
Notes: Please contact PIKE Technologies for items not described in this list.
Reconditioning service for used ATRMax crystal plates is available.
Resistively Heated Pl ates Specifications
Ambient to 120 °C
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Sensor Type
Controller
29
Temperature Range
Accuracy
Digital
+/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Input Voltage100–240 VDC, auto setting,
external power supply
Operating Voltage
24 VDC/36 W
The VeeMAX III with ATR offers continuous variable angle of incidence
and a variety of crystal plates to selectively control the depth of
penetration of the IR beam into the sample. ATR applications
include the study of layered samples, coatings, release agents,
monolayers on silicon and chemical migration studies.
The VeeMAX III with ATR accessory provides exceptionally
high throughput (over 50% with 45 degree ZnSe crystal) to minimize
sampling time and enable detection of low concentration
components in samples of complex composition. The crystal flat
plates offered for the VeeMAX III are ideal for solid and layered
samples and are designed for use with the optional pressure clamp.
The combination of large crystal diameter (20 mm) and slip-clutch
pressure clamp provides sample-to-crystal contact without altering
layered sample composition. The optional liquids retainer may be
added to the crystal plate for analysis of liquid samples.
A t tenuated T otal R eflectance
VeeMAX III with ATR –
Variable Angle, Single Reflection ATR for Depth Profiling Studies
Features
• Continuously variable set angle of incidence – 30 to
80 degrees
profiling studies
• High throughput for excellent quality spectra
• Optional, high-pressure clamp for sampling of films,
coatings or powdered samples
• Integrated position for manual or automated polarization
• Motorized option with electronic control module and
AutoPRO software for automated, high-precision experiments
• VeeMAX III can be used as a variable angle of incidence
Monolayers and ultra-thin films absorbed on silicon or gold
substrate are easily sampled using the VeeMAX III equipped with a
high refractive index ATR crystal. Compared to specular reflectance
sampling for monolayer analysis, an increase in sensitivity of up
to 1–2 orders of magnitude may be realized via ATR sampling.
For these applications, the VeeMAX III accessory is configured to
include a high-angle Ge flat plate (60 or 65 degrees), the highpressure clamp with a 7.8-mm pressure tip, and a polarizer.
www.piketech.com
specular reflection accessory
• Configurable for specialized applications – monolayer
studies and spectroelectrochemistry
• Sealed and purgeable optical design to eliminate water
vapor and carbon dioxide interferences
Analysis of monomolecular layer on silicon – VeeMAX III with 60 degree
Ge crystal, pressure clamp with 7.8-mm tip and p polarization.
608-274-2721
VeeMAX III
with ATR
optical layout
Pike Technologies
• 0.4 to 46 micron depth of penetration – ideal for depth
Depth profiling study of layered polymer film. FTIR spectra collected
using ZnSe crystal at set angles of incidence from 43 to 65 degrees.
IR absorbance band at 1591 cm-1 clearly increases relative to other
bands as we probe deeper into the sample.
30
Liquids, Solids and In-Between
A spectroelectrochemical cell option for the VeeMAX III is also
available. The innovative design offers a chemical-resistant vessel
sealed to an ATR crystal, which is mounted on the VeeMAX III.
The crystals are interchangeable for optimizing spectral results
and are removable to allow electrode coating on the ATR surface.
The high throughput of the VeeMAX III with ATR provides excellent
sensitivity and reduced sampling time. Alternatively, a flat IR
transparent window or 60 degree CaF2 prism may be installed to
permit specular reflectance sampling. The electrochemistry cell is
equipped with a precision micrometer for electrode positioning,
and is user-configurable.
Motorized control of angle of incidence via personal computer
for automated data collection is available for the accessory. The
motorized VeeMAX III is ideal for depth of profiling studies as it
greatly speeds and improves the precision and reproducibility of the
data collection process.
AutoPRO Software
control of VeeMAX III
angle of incidence
(automated polarizer
available) for
automated depth
profiling studies,
angle of incidence and
polarization angle can
be set independently.
Spectroelectrochemical
cell with removable and
interchangeable crystals
mounted on the VeeMAX III.
V e e MAX III w i t h ATR S p e c i f i c a t i o n s
ATR Crystal Choice
Crystal Plate Mounting
Crystal Plate Mounts
Crystal Dimension
(surface)
Optics
TempPRO software for graphical setup and control of kinetic
measurements.
Heated crystal plate
31
Stainless Steel
20-mm diameter
All reflective
Pressure DeviceRotating, continuous variable pressure; click stop at maximum
Heating Options
Accuracy
Temperature controlled crystal flat plates are available for
thermal studies. The maximum temperature is 130 oC for all crystal
types. PIKE Technologies’ PC version temperature controller allows
up to 20 ramps to be easily programmed using PIKE TempPRO
software, and data collection as a function of time or temperature
may be prescribed for most FTIR spectrometers.
User-changeable plates
VeeMAX III spectroelectrochemical cell – maximum flexibility with its
interchangeable and removable crystals.
ZnSe, Ge, Si, ZnS
Sensor Type
130 °C
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Temperature ControlDigital or digital with PC control (up to 20 ramps, automated data
collection, USB interface)
Input Voltage100–240 VAC, auto setting, external
power supply
Operating Voltage
Purge Sealing
Accessory Dimensions
(W x D x H)
Spectroelectrochemical Vessel Dimensions
25 mm dia tapering to 19 mm,
25 mm tall
Spectroelectrochemical Vessel Volume
7.5 mL
Spectroelectrochemical Vessel Material
Polytetrafluoroethylene or PEEK
FTIR Compatibility
24 VDC/50 W
Purge tubes and purge barb included
177 x 92 x 162 mm (excludes clamp
height and baseplate)
Most, specify model and type
O r d e r i n g I n fo r m a t i o n
V ee MAX III S ampling O ptions
Part Number Description
Part Number Description
013-11XX
013-2851
Motorized Option for VeeMAX III
090-1000
Manual Polarizer, ZnSe
090-1200
Manual Polarizer, KRS-5
090-3000
Precision Manual Polarizer, ZnSe
090-3200
Precision Manual Polarizer, KRS-5
Part Number Description
090-5000
Precision Automated Polarizer, ZnSe, USB
013-4021
Flat Plate, ZnSe, 45°
090-5100
Precision Automated Polarizer, KRS-5, USB
Flat Plate, ZnSe, 60°
007-0300
PIKECalc Software
013-4041
Flat Plate, Ge, 45°
013-4051
Flat Plate, Ge, 60°
013-4061
Flat Plate, Ge, 65°
Notes: PIKECalc software provides easy calculations of depth of penetration, effective
angle of incidence and critical angle for ATR measurements. Motorized Option includes
PIKE Technologies AutoPRO software and controller. Other polarizer options are
found in the polarization section of this catalog. Motorized VeeMAX III and
automated polarizer interface simultaneously.
013-4081
Flat Plate, Si, 45°
013-4071
Flat Plate, Si, 60°
013-4091
Flat Plate, ZnS, 45°
013-3300 Electrochemical Cell, PTFE
013-4096
Flat Plate, ZnS, 60°
013-3370
Electrochemical Cell, PEEK
013-3401
Liquids Retainer for VeeMAX III ATR crystals
013-3402
Heated Electrochemical Cell, PTFE
013-3501 VeeMAX III ATR Flow Cell
160-5546 ZnSe Crystal, 45°
160-5550 ZnSe Crystal, 60°
160-5547
Ge Crystal, 45°
160-5551
Ge Crystal, 60°
VeeMAX III Variable Angle Specular Reflectance Accessory
Includes specular reflectance masks (2, 5/8 and 3/8”), purge
tubes, purge kit and spectrometer base mount.
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
C rystal P lates for V ee MAX III ATR
(must select 1 or more for ATR)
013-4031
Notes: VeeMAX III Crystal Plates are pre-aligned and pinned-in-place. Changing
crystal plates is easy and fast to optimize sampling results. ZnS crystal plate is
excellent for deepest penetration of IR beam. Si crystal plate is excellent for
far-IR ATR. If you need a crystal not listed here, please contact us. Flow cell and
Liquids Retainer require High-Pressure Clamp. Reconditioning service for used
VeeMAX crystal plates is available.
S pectroelectrochemical C onfiguration
Part Number Description
160-5548
Si Crystal, 45°
O ptional C rystal P lates for H eated V ee MAX III ATR
160-5552
Si Crystal, 60°
Part Number Description
160-5549
ZnS Crystal, 45°
160-5553
ZnS Crystal, 60°
013-4131
Heated Flat Plate, ZnSe, 60°
160-5527
013-4141
Heated Flat Plate, Ge, 45°
CaF2 Crystal, 60°
160-1144
013-4151
Heated Flat Plate, Ge, 60°
CaF2 Flat Window, 20-mm diameter
160-1304
ZnSe Flat Window, 20-mm diameter
013-4161
Heated Flat Plate, Ge, 65°
013-3320
Flat Window Holder, DelrinTM
013-4171
Heated Flat Plate, Si, 60°
013-3345 45° Crystal Holder, Delrin
013-4181
Heated Flat Plate, Si, 45°
013-3360
60° Crystal Holder, Delrin
013-4191
Heated Flat Plate, ZnS, 45°
013-3374
45° Crystal Holder, PEEK
013-4196
Heated Flat Plate, ZnS, 60°
013-3376
60° Crystal Holder, PEEK
076-1220 Digital Temperature Control Module
013-3445
Heated 45° Crystal Holder
076-1420 Digital Temperature Control Module, PC Control
013-3460
Heated 60° Crystal Holder
Notes: Heated VeeMAX III crystal plates may be heated to 130 °C. Temperature
control module selection is required for heated crystal plates. Digital temperature
control module with PC control includes TempPRO software.
Part Number Description
Notes: The electrochemical configuration requires electrochemical cell, crystal
or window holder and VeeMAX III accessory. Must select one or more crystal or flat
window. Choose a crystal holder to match the crystal angle. A flat window or CaF2
crystal are used for specular reflectance sampling. Other window types for specular
reflectance measurements may be found in our listing of transmission windows,
20 mm x 2 mm. The heated electrochemical cell requires the choice of a digital
temperature controller. Electrodes supplied by the end-user.
013-3101
VeeMAX III ATR Pressure Clamp
R eplacement P arts
025-3094
7.8-mm ATR Pressure Tip
Part Number Description
P ressure C lamp for
powder analysis)
V ee MAX III (must select for solids, films or
013-4010
Mask Set for VeeMAX
300-0002
Gold Substrate Alignment Mirror, 1.25 x 3.0”
608-274-2721
Notes: The pressure clamp is required for solids, films, coatings and powdered
samples. The pressure clamp is supplied with 20-mm tip for polymer films. The 7.8-mm
pressure tip is required for monolayers on silicon or small samples.
www.piketech.com
Heated Flat Plate, ZnSe, 45°
Pike Technologies
013-4121
A t tenuated T otal R eflectance
V ee MAX III B ase O ptics (must select)
32
Liquids, Solids and In-Between
JetStream ATR Accessory –
Measurements of Liquids under Varying Conditions
The ATR crystal for the JetStream ATR accessory is of a
cylindrical shape and is 82-mm long and 6.4-mm in diameter. To
optimize accessory performance, crystal geometry has been carefully
chosen. The design of the JetStream ATR accessory provides 12
reflections of the IR beam along the crystal surface. The volume of
the sample chamber is 1.3 mL.
Heating up to 200 °C may be realized with the heated JetStream
base. PIKE Technologies offers digital and PC programmable
temperature controllers. Ramps and hold times are easily
programmed through TempPRO software when using the PC
module. Data collection may be initiated as a function of time or
temperature with many FTIR spectrometers.
Features
• Efficient ATR design for static and flowing liquid measurements
• Small sample chamber provides efficient sampling
• ZnSe and Germanium crystal options to match sample
requirements
• Qualitative and quantitative applications
• Temperature control option up to 200 °C
• Pressures up to 1500 psi
Heated JetStream
accessory
The PIKE Technologies JetStream is a unique ATR accessory
optimized for analysis of liquids in static or flow modes at varying
pressure. The accessory design revolves around a cylindrical ATR crystal
that is encased in a heavy-duty stainless steel body. The sample is
introduced via a compression filling from 1/16” up to 1/4” tube OD and
completely surrounds the ATR crystal providing efficient sampling for
excellent reproducibly and sufficient throughput for high sensitivity
measurements. The maximum pressure rating is 1500 psi.
The compact cell design employs a pair of transfer optics to direct
the infrared beam to one end of an IR transmitting ATR crystal. A similar
pair of optics directs the beam emitted from the other end of the ATR
crystal to the spectrometer detector.
Selection of the digital control module, PC control includes PIKE TempPRO™
software for graphical setup and automated data collection for thermal
experiments.
Optical diagram of the JetStream ATR
Isopropanol spectrum collected using the JetStream with ZnSe crystal.
33
O r d e r i n g I n fo r m a t i o n
Specifications
Cell Body
020-19XX
JetStream ATR Base Optics Assembly
ATR Crystals
020-18XX
Heated JetStream ATR Base Optics Assembly
Crystal Size
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Choose a temperature controller below for the Heated JetStream. Ge becomes
opaque near 100 °C.
Crystal Face Angle45°
Cell Volume
ATR C rystals for J et S tream (must select one)
Liquid Connectors
Part Number Description
Maximum Pressure
020-2010
ZnSe Rod
Heating Options
020-2050
Ge Rod
Accuracy Sensor Type T emperature C ontroller for J et S tream
Part Number Description
076-1220
Digital Temperature Control Module
076-1420
Digital Temperature Control Module, PC Control
ZnSe or Germanium
82 mm x 6.4 mm
Number of Reflections12
1.3 mL
316 Stainless Steel Swagelok®
1500 psi
Ambient to 200 ºC maximum
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Temperature Control Digital or digital with PC control (up
to 20 ramps, automated data collection, USB interface)
Input Voltage 100–240 VAC, auto setting, external
power supply
Operating Voltage
Part Number Description
Accessory Dimensions (W x D x H)
020-3040
EPDM Crystal O-Rings, 120 °C max (2 ea.)
FTIR Compatibility
020-3041
EPDM Housing O-Rings, 120 °C max (2 ea.)
020-3045
Perfluoroelastomer Crystal O-Rings (2 ea.)
020-3046
Perfluoroelastomer Housing O-Rings (2 ea.)
R eplacement P arts
316 Stainless Steel
3 A/24 VDC/75 W
153 x 100 x 108 mm
(excludes FTIR baseplate and mount)
Most, specify model and type
A t tenuated T otal R eflectance
Part Number Description
Pike Technologies
www.piketech.com
608-274-2721
34
Liquids, Solids and In-Between
Classic VATR –
Variable Angle ATR for Analysis of Solids, Films and Coatings
The Variable Angle ATR is a traditional in-compartment accessory
with the ATR crystal mounted vertically with respect to the spectrometer baseplate. Its optical layout is based on an optimized
Gilby configuration and allows continuous adjustment of the
incident beam angle between 30 to 60 degrees. This accessory
is suitable for the analysis of solids, films and coatings, but for
obvious reasons, it cannot be used for working with liquids. For
enhanced sensitivity the sample may be mounted on both sides
of the crystal. A unique mirror adjustment mechanism which
utilizes mirror placement and proportional pivoting allows precise
and repeatable alignment. PIKE Technologies’ Variable Angle ATR
offers flexibility when the frequent replacement of ATR crystals is
required. VATR is an excellent, low-cost tool for teaching the
principles of internal reflection spectroscopy, and for basic research.
O r d e r i n g I n fo r m a t i o n
VATR B ase O ptics (must select)
Part Number Description
Features
021-19XX
VATR Variable Angle, Vertical ATR
• 30 to 60 degree – continuously variable angle of incidence
• Full control over the number of reflections and depth
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
VATR Base Optics includes plate for mounting in FTIR spectrometer slide mount.
• Unique mechanism for fine-tuning mirror positions and
Part Numbers
P/N 50 mm P/N 25 mm
Description
160-5528
160-5530
KRS-5, 45° Parallelogram
160-5529
160-5531 KRS-5, 60° Parallelogram
160-5532
160-5533 ZnSe, 45° Parallelogram
160-5543
160-5540 ZnSe, 60° Parallelogram
160-5541
160-5538 Ge, 30° Parallelogram
160-5534
160-5536 Ge, 45° Parallelogram
160-5535
160-5537 Ge, 60° Parallelogram
160-5544
160-5539 Si, 45° Parallelogram
of penetration
precise and repeatable alignment
• High energy throughput
• Stainless steel, easy to remove crystal mounts and anvils
• Economical introduction to ATR techniques – excellent
R&D and teaching tool
C rystal O ptions for VATR (must select 1 or more)
Notes: VATR crystals are available in lengths of 25 and 50 mm. All are 3-mm
thick and 10-mm wide. Select crystal length and type based upon desired sample
absorbance and spectral range.
C rystal H older and C lamp for VATR
(must select 1 or more to hold ATR crystals)
Part Number Description
021-5050
50-mm VATR Crystal Holder and Clamp
021-5020
25-mm VATR Crystal Holder, Clamp and Mirror
Note: The pressure clamp is selected for the ATR crystal length.
VATR R eplacement P arts
Part Number Description
021-5040
25-mm VATR Crystal Holder and Clamp
021-5030
Set of 25-mm and 50-mm Pads
Note: Please contact PIKE Technologies for items not described in this list.
35
Attenuated Total Reflectance (ATR) is today the most widely used
FTIR sampling tool. ATR generally allows qualitative or quantitative
analysis of samples with little or no sample preparation, which
greatly speeds sample analysis. The main benefit of ATR sampling
comes from the very thin sampling pathlength and depth of
penetration of the IR beam into the sample. This is in contrast to
traditional FTIR sampling by transmission where the sample must
be diluted with IR transparent salt, pressed into a pellet or pressed to
a thin film, prior to analysis to prevent totally absorbing bands in
the infrared spectrum.
A comparison of transmission versus ATR sampling results for
a thick polymer sample is shown below where the sample is too
thick for high-quality transmission analysis (shown in the lower
blue spectrum). In transmission spectroscopy, the IR beam passes
through the sample and the effective pathlength is determined by
the thickness of the sample and its orientation to the directional
plane of the IR beam. Clearly in the example below the sample is
too thick for transmission analysis because most of the IR bands
are totally absorbing. However, simply placing the thick sample on
the ATR crystal (Diamond MIRacle) and applying pressure generates
a nearly perfect result (upper red spectrum) – identified by a library
search as a polybutylene terephthalate. The total analysis time for
the thick polymer by ATR was less than 1 minute.
While the analysis of samples by ATR is easy, it is interesting
and useful to be aware of each of the following experimental
factors and how they affect the final spectrum:
• Refractive indices of the ATR crystal and the sample
• Angle of incidence of the IR beam
• Critical angle
• Depth of penetration
• Wavelength of the IR beam
• Effective pathlength
• Number of reflections
• Quality of the sample contact with ATR crystal
• ATR crystal characteristics
The refractive indices of the crystal and sample are important
considerations in the ATR sampling technique by virtue of the
following equation:
ATR and transmission spectra of a thick polymer sample.
How ATR Works
www.piketech.com
With ATR sampling we direct the IR beam into a crystal of relatively
higher refractive index. The IR beam reflects from the internal
surface of the crystal and creates an evanescent wave, which
projects orthogonally into the sample in intimate contact with
the ATR crystal. Some of the energy of the evanescent wave is
absorbed by the sample and the reflected radiation is returned to
the detector. This ATR phenomenon is shown graphically in the
following representation of a single reflection ATR.
Evanescent Wave
Bulk Sample
ATR Crystal
Pike Technologies
where θc is the critical angle, n2 is the refractive index of the sample
and n1 is the refractive index of the crystal.
When the angle of incidence exceeds the critical angle, we will
observe a purely ATR spectral result. If the critical angle is not met,
we will observe a combined ATR and external reflectance result.
This occurs if the angle of incidence of the IR beam is too low, if
the refractive index of the crystal is too low, if the refractive index of
the sample is too high or a combination of these three factors. In
most cases this problem is not observed; however, an example of
this is shown in the following spectral data. The sample is a high
refractive index liquid (n1=1.8) run on a 45 degree accessory using
diamond and Ge crystal plates. The spectrum run on the Ge crystal
plate exhibits a normal baseline and symmetric absorbance bands
– critical angle is met. The spectrum run on the diamond crystal
plate has a baseline shifted and asymmetric absorbance bands due
to non-adherence to the critical angle requirements for this set of
analysis parameters.
A t tenuated T otal R eflectance
ATR – Theory and Applications
Another way to correct the spectral artifacts observed (above) in
the high refractive index sample spectrum would be to increase
the angle of incidence in the ATR accessory to a value above the
critical angle. Adjustment or selection of the angle of incidence is
available in several of the PIKE Technologies ATR accessories.
608-274-2721
Spectra of high refractive index liquid using Ge (red) and
diamond (blue) ATR crystals.
Graphical representation of a single reflection ATR.
36
Liquids, Solids and In-Between
Table 1: Pathlengths and penetration depth (in microns), and ATR crystals at various angles of incidence (in degrees) and numbers of reflections.
ATR Sampling ZnSe, Diamond AMTIR Ge
n1 = 2.4
n1 = 2.5
n1 = 4.0
for n2 = 1.5
λ = 1000 cm-1
θc = 38.7°
θc = 36.9°
θc = 22.0°
θ
NdpdeEPL dpdeEPL dpdeEPL
45
1
2.0 4.364.36 1.7 3.383.38 0.660.610.61
45
3
2.0 4.3613.08 1.7 3.3810.15 0.66 0.611.84
45
10
2.0 4.3643.60 1.7 3.3833.84 0.66 0.616.14
30 1 N/AN/AN/A N/A N/AN/A 1.21.591.59
30 3 N/AN/AN/A N/A N/AN/A 1.21.594.76
30 10 N/AN/AN/A N/A N/AN/A 1.21.59
15.85
60
1 1.111.531.53 1.02 1.301.30 0.510.320.32
60
3 1.111.534.59 1.02 1.303.91 0.510.320.97
60
10 1.11 1.5315.32 1.02 1.3013.03 0.51 0.323.23
Note: N/A indicates critical angle is violated.
Further useful consideration for ATR analysis is the depth of
penetration (dp) of the IR beam into the sample. Technically, this
is defined as the distance required for the electric field amplitude
to fall to e-1 of its value at the surface and is further defined by
An example of the benefit of increased number of reflections
is shown in the following spectral data for the analysis of carbohydrate content in a soft drink sample. The red spectrum is run
using a 10-reflection HATR accessory. The blue spectrum is run using
a single-reflection ATR using an identical scaling factor. Clearly the
minor carbohydrate bands are more readily apparent in the multireflection ATR accessory.
where λ is the wavelength of light and θ is the angle of incidence
of the IR beam relative to a perpendicular from the surface of the
crystal. Typical depth of penetration in ATR ranges from about 0.5
microns up to about 5 microns depending upon these experimental
conditions. Shown in the graphical representation of the ATR
phenomenon, the strength of the evanescent wave decays rapidly
as we progress from the surface of the ATR crystal. If we wish to
compare the sample absorbance of the ATR measurement with
that of a transmission measurement, we need to calculate the
volume of the evanescent wave, known as the effective penetration
of the IR beam. The effective penetration (de), is unique for parallel
polarization (deII) and perpendicular polarization (d⊥) and these
are defined by:
Soft drink sample using 10-reflection and 1-reflection ATR.
Where
The effective penetration for an unpolarized IR beam is the
average of the parallel and perpendicular penetration.
Generally, a single reflection ATR is ideal for qualitative analysis,
“what is my sample?” When we need to look at minor components
of a sample for qualitative or quantitative analysis, then we need
to increase the effective pathlength (EPL) by increasing the number
of reflections (N) within the ATR crystal. The effective pathlength
in ATR is derived by the following equation, where N = number of
reflections on the sample.
37
For your convenience we have calculated theoretical values of
depth of penetration, effective penetration, and effective pathlength
for typical combinations of crystal materials, angles of incidence,
and number of reflections (Table 1).
With the thin penetration of the evanescent wave into the
sample, it is obvious that intimate contact of the sample be made
onto the surface of the ATR crystal. For liquid or pliable samples,
quality of sample contact with the ATR crystal is generally not
a problem. For rigid, irregular shaped or porous samples, high
pressure sufficient to deform the sample will increase the extent
of sample contact and thereby increase sample absorbance. This is
shown in the following spectral data collected for a porous foam
polymer using a MIRacle ATR with ZnSe crystal.
Porous foam sample with high pressure (red) and low pressure (blue).
Table 2: ATR crystal characteristics for FTIR sampling.
dp, for n2 = 1.5 λ = 1000 cm-1, 45 deg, microns
n1
Crystal
Water Solubility
pH Range
g/100 g
Hardness
kg/mm
AMTIR2.5
1.70
Insoluble
1–9
170
Diamond2.4
2.01
Insoluble
1–14
5,700
Germanium4.0
0.66
Insoluble
1–14
550
KRS-52.37
2.13
0.05
5–8
40
Silicon3.4
0.85
Insoluble
1–12
1,150
ZnS2.2
3.86
Insoluble
5–9
240
ZnSe2.4
2.01
Insoluble
5–9
120
A t tenuated T otal R eflectance
The blue spectrum was collected with low pressure applied to
the foam sample, whereas the red spectrum is produced with high
pressure. The ATR absorbance using high pressure is about 10 times
greater than with low pressure – all other sampling factors are
identical. For rigid, crystalline, or hard, irregular surface samples we
recommend a single reflection Diamond MIRacle ATR because it is
easy to apply high pressure onto the small crystal (1.8 mm diameter)
with the high-pressure clamp, producing over 10,000 psi.
The selection of the ATR crystal characteristics should be
matched to the type of samples we run. Selection can be made to
control depth of penetration of the IR beam, for hardness to prevent
crystal damage, for desired spectral range and for acceptable pH
range for acid or caustic samples. No individual crystal type will
solve all problems, so PIKE Technologies offers a broad range of
choices for ATR. Table 2 will give you some guidelines for selection
of your ATR crystal.
Pike Technologies
www.piketech.com
608-274-2721
38
PIKE Video Library Links —
Video Application Notes and Tips
Click on the links below to access a wealth of informational videos featuring spectroscopic
applications and sampling tips. Topics cover a range of sampling techniques including ATR,
diffuse reflectance, transmission and more. Find other videos on our website such as PIKE
software tutorials and an assortment of product showcases.
Proper Filling of an IR
Liquid Cell
IR Transmission
Measurements of
Diffuse Reflectance
Accessing Formulation in
Polymeric Materials
ATR: Single vs. Multiple
Reflection
Troubleshooting Inverted
Bands in the Spectrum
Depth of Penetration vs.
Effective Penetration
Monitoring the
Thermal Treatment of a
Heterogeneous Catalyst
KBr: Proper Use and
Handling Methods
Factors Influencing
Spectral Quality for MidIR Diffuse Reflectance
The ABC’s of Liquid
Transmission Sampling
Calculating
Critical Angle
Sample Preparation
for Mid-IR Diffuse
Reflectance
Diffuse Reflectance
Diffuse reflectance is a highly sensitive technique for the
analysis of powdered and solid samples. Typically, a sample is
ground with KBr into a fine powder and run without making
pellets. Some samples can be run directly without dilution,
especially if one is looking for minor components.
Diffuse reflectance sampling is ideally suited for automation
and PIKE offers configurations for high-capacity sampling.
EasiDiff™ Page 40
Diffuse reflectance accessory
Analyze a wide variety of solid and powder samples
DiffusIR™ Page 41
Research-grade diffuse reflectance accessory
With environmental chambers for heating/cooling
UpIR™ Page 43
Upward-looking diffuse reflectance
Out-of-compartment design for large sample analysis
AutoDiff™ Page 44
Automated diffuse reflectance
Analyze multiple samples with minimal intervention
XY Autosampler Page 45
Transmission and reflection in microplate format
Ideal for speed and reproducibility
Sampling Kits Page 46
Sample collection, preparation and loading
For analysis of powders or solids
Theory and
A pplications
Page 47
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
From Powders to Plastic Bumpers
EasiDiff –
Workhorse Diffuse Reflectance Accessory
A spectrum of papaverine hydrochloride (1% in KBr powder) collected
using the PIKE Technologies EasiDiff diffuse reflectance accessory.
O r d e r i n g I n fo r m a t i o n
Part Number Description
042-10XX
EasiDiff Accessory with
Sample Preparation Kit
Includes 2 micro sample cups,
2 macro sample cups,
EasiPrep Sample Preparation Kit,
alignment mirror, 35-mm mortar
with pestle and KBr powder (100 g)
042-50XXEasiDiff Accessory, NIR Version with Gold-Coated Optics
Includes 2 micro sample cups, 2 macro sample cups, EasiPrep
Sample Preparation Kit, alignment mirror, 35-mm mortar
with pestle and KBr powder (100 g)
Features
• Pre-aligned optical components for reproducible,
high-quality data
O ption
Part Number Description
• Micrometer-controlled sample positioning and focusing
• High-energy throughput providing nanogram sensitivity
• Precision slide for repeatable sample introduction and
042-3010
• Unique Sample Preparation and Loading Kit included
Notes: The abrasion sampling kit is used to measure
intractable solids. Disks are disposable. Ordering
information for replacements may be found below.
efficient collection of background and sample spectra
The PIKE Technologies EasiDiff is an economical, high-quality diffuse
reflectance accessory designed to analyze a wide variety of solid
samples. It is most often used in the analysis of pharmaceuticals,
illicit drugs, inorganic solids and minerals, and powdered chemicals.
The EasiDiff reduces the time required to produce an infrared
spectrum compared to KBr pellet techniques. Typically, a small
amount of sample (about 1%) is mixed with KBr powder and the
spectrum is collected.
The EasiDiff employs an elegant, high-performance optical
design for maximum energy throughput and ease of operation.
Optical components critical to achieving this performance are
permanently aligned. Focusing is achieved by bringing the sample
(not the collection mirror) to the optimum position with a
micrometer. A dual-position sample holder permits background
and sample collection in a simple, two-step process.
A special version of the EasiDiff with gold-coated optics for NIR
measurements is also available.
41
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
Abrasion Sampling Kit
Includes sample collector tool
and stainless steel sample post,
25 diamond abrasive disks and
75 silicon carbide abrasive disks
R eplacement P arts and S upplies
Part Number Description
042-2010
Micro Sample Cup, 6.0 mm diameter, 1.6 mm deep (2 ea.)
042-2020Macro Sample Cup, 10 mm diameter, 2.3 mm deep (2 ea.)
042-2025
EasiDiff Sample Slide
160-8010
KBr Powder (100 g)
042-3020
Abrasion Disks, silicon carbide (100 ea.)
042-3025
Abrasion Disks, diamond (50 ea.)
042-3030
Sample Cup Holder and Base
042-3040
Sample Preparation Kit
042-3080
Alignment Mirror, aluminum
042-3082
Alignment Mirror, gold
042-3060
Flat Sample Post
Note: Please contact PIKE Technologies for items not described in this list.
DiffusIR –
Research Grade Diffuse Reflectance Accessory
• Large, highly efficient collection optics for maximum
D iffuse R eflectance
Features
Advanced temperature studies of
materials in controlled environments can
be done using the PIKE environmental
chambers. Chambers for the DiffusIR can
be operated at temperatures ranging from
-150 to 1000 ºC and at pressures up to
1500 psi. The optional chambers are easily
inserted into the DiffusIR and secured
using push-lock pins.
Coupling the environmental chambers with the PIKE
PC-Controlled Temperature Module and TempPRO™ software
provides the ability to graphically set up the experiment with
up to 20 ramps and initiate data collection at specified time or
temperature intervals when used with most FTIR instruments.
A special version of the DiffusIR with gold-coated optics is
available for maximum mid-IR performance and for NIR diffuse
reflectance sampling. The DiffusIR and its options are compatible
with most FTIR spectrometers.
sensitivity and detection limits
• Micrometer-controlled sample focus to optimize results
for every sample
• Optional environmental chambers for heating, cooling,
high-vacuum and high-pressure applications
• Quick release feature of environmental chambers for easy
insertion and removal of sealed chambers
• Digital PC controller option for macro control of data
collection at user specified temperatures or times
• Sealed and purgeable optical design to eliminate water
vapor and carbon dioxide interference
PIKE Technologies TempPRO software provides a graphical interface for
temperature control and kinetic measurements.
Pike Technologies
Optical geometry of
the DiffusIR accessory
Thermal transformation of hydrated inorganic compound measured
using the DiffusIR with environmental chamber. Spectra automatically
collected between 80 and 160 ºC at 5º increments using PIKE TempPRO
software.
608-274-2721
With the DiffusIR, sample introduction is performed using an
integral 2-position slide – enabling background and sample spectra
to be collected without loss of purge. The sample height can be
optimized by using the micrometer sample focusing adjustment.
In this manner the sensitivity of the accessory is maximized
without sacrificing precision. The DiffusIR comes equipped with
a Sample Preparation and Loading Kit and a Sample Abrasion Kit
for the analysis of intractable samples. The DiffusIR optics are
enclosed and equipped with purge tubes for the elimination of
atmospheric interferences.
www.piketech.com
The PIKE Technologies DiffusIR™ is a research-grade diffuse
reflectance accessory with an efficient optical design
accommodating the optional PIKE Technologies environmental
chambers. These specialized chambers can be used to study
thermodynamic properties of materials, to determine reaction
mechanisms, to perform catalytic studies and much more.
The heart of the DiffusIR is a unique monolithic ellipsoidal
reflector permanently fixed in place – eliminating the need for
repositioning the focus optics for sample placement. The DiffusIR
optical design is optimized to efficiently collect diffuse radiation
generated from the sample and minimize the effects of the specular
radiation component.
Liquid nitrogen cooled system and temperature control module
42
From Powders to Plastic Bumpers
O r d e r i n g I n fo r m a t i o n
D iffus IR A ccessory (must select one)
R eplacement P arts and S upplies (cont.)
Part Number Description
Part Number Description
041-10XX
160-1132
Disk, KBr, 32 x 3 mm
160-1113
Disk, ZnSe, 32 x 3 mm
160-1231 Disk, ZnSe, 32 x 3 mm, with anti-reflective coating
DiffusIR Accessory
Includes Sample Preparation Kit with 2 micro and 2 macro
sample cups, sample loading tools, Abrasion Sampling Kit,
SiC and diamond sampling disks, alignment mirror, 35-mm
mortar with pestle and KBr powder (100 g)
041-60XX
DiffusIR Accessory with Gold-Coated Optics
Includes Sample Preparation Kit with 2 micro and 2 macro sample cups, sample loading tools, Abrasion Sampling Kit,
SiC and diamond sampling disks, alignment mirror, 35-mm
mortar with pestle and KBr powder (100 g)
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
D iffus IR O ptions
Part Number Description
162-4150
DiffusIR Environmental Chamber, HTV, ambient to 500 °C
162-4200
DiffusIR Environmental Chamber, HTV, ambient to 1000 °C
162-4180
High-Pressure Adapter Dome for Chambers, HTV
162-4140
DiffusIR Environmental Chamber, LTV, -150 to 500 °C
Notes: HTV and LTV chambers require the selection of a temperature control
module. DiffusIR Chambers include front plate accommodating environmental
chamber (easily changeable with standard DiffusIR front plate), Pin-Loc chamber
insertion for easy sample exchange, KBr window, ceramic sampling cups
compatible with vacuum and reaction formats, ports and 2 shut-off valves for
vacuum operation and ports for connection of water cooling. The 500 °C and
1000 °C HTV chambers may be fitted with the high-pressure adapter and are
easily switchable from standard vacuum to high-pressure operation. The
LTV chamber is not compatible with simultaneous pressurization and low
temperature operation. Operation of the LTV at sub-ambient temperatures
requires part number 162-4160 Liquid Nitrogen-Cooled System and Temperature
Control Module and rotary pump for vacuum insulation. All chambers require a
liquid circulator to reduce heat transfer to the outer housing and to preserve the life
of the chamber heaters.
160-5049
Disk, SiO2, 32 x 3 mm
160-5125
Disk, SiO2, 32 x 3 mm, low OH
160-1159
Disk, Si, 32 x 3 mm
162-4210
O-Ring for DiffusIR Chamber (10 ea.)
162-4215
O-Ring for DiffusIR Chamber cooling line (10 ea.)
162-4251
Ceramic Cup for DiffusIR Chamber, porous
162-4270
Alignment Mirror for DiffusIR Chamber
042-3082
Alignment Mirror, gold
Notes: Please contact PIKE Technologies for items not described in this list.
D i ff u s IR S p e c i f i c a t i o n s
Optical Design
Angle of Incidence
3X ellipsoidal
30 degrees, nominal
Dimensions (W x D x H)180 x 230 x 130 mm (excluding purge
tubes and baseplate)
Sample FocusMicrometer
Sample Positions2 positions, slide stops for background
and sample with no purge loss
Sample CupsMicro: 6 x 1.6 mm deep
Macro: 10 x 2.3 mm deep
Purge
T emperature C ontrol M odules
S tandard purge tubes and
purge connection
Environmental Chamber Specifications
Part Number Description
076-2450
076-2250
PC Controlled Temperature Module, HTV Chambers
Includes Digital Temperature Selection and TempPRO software
Digital Temperature Control Module, HTV Chambers
162-4160 Liquid Nitrogen-Cooled System and Temperature Control
Module DiffusIR Environmental Chamber, LTV, -150 to 500 °C
Notes: PC Controlled Temperature Module with TempPRO software provides a
graphical user interface for setting experiment parameters and data collection.
Please contact PIKE for PC compatibility. The Temperature Control Modules for the
HTV and LTV chambers are not interchangeable.
R eplacement P arts and S upplies
Part Number Description
170-1100
Liquid Recirculator
042-2010
Sample Cup, micro, 6 mm diameter, 1.6 mm deep (2 ea.)
042-2020Sample Cup, macro, 10 mm diameter, 2.3 mm deep (2 ea.)
43
Temperature Range, HTV
Ambient to 500 or 1000 °C
Temperature Range, LTV
-150 to 500 °C
Accuracy
+/- 0.5%
Input Voltage100–240 VAC (HTV version)
110/220 V switchable (LTV version)
Operating Voltage 28 VDC/84 W (HTV and LTV versions)
Temperature Control
Heating Rate, Maximum
Digital or Digital PC
120 °C/minute
Kinetic Setup (requires Digital PC Controller,
includes PIKE
TempPRO software)
• Up to 20 temperature ramps
• Individual ramp rate and hold
time settings
• Graphical display of experiment
settings
• Trigger data collection at specified times or temperatures
• USB interface
042-3030
Sample Cup Holder and Base
Sensor
K Type (for HTV)
RTD Type, Pt100 (for LTV)
160-8010
KBr Powder (100 g)
1 x 10-6 Torr (13 x 10-4 Pa)
042-3040
Sample Preparation Kit
042-3010
Abrasion Sampling Kit
042-3020
Abrasion Disks, silicon carbide (100 ea.)
042-3025
Abrasion Disks, diamond (50 ea.)
042-3060
Flat Sample Post
042-3080
Alignment Mirror, aluminum
162-4303
Rotary Pump for vacuum insulation
Vacuum Achievable
Window Size32 x 3 mm disk (vacuum)
32 mm ZnSe dome (pressure)
Leaking Volume
< 6.0 x 10-11 Pa m3/sec
Pressure Maximum• 1500 psi, with High-Pressure Adapter
(available in HTV versions only)
• 14.7 psi (1 atmosphere) using KBr
window
Sample Cup SizeMacro: 6.0 mm OD, 4.0 mm height
Micro: 4.7 mm ID, 2.0 mm depth
Sample Cup DesignPorous ceramic compatible with
powders and gas flow
Cooling Ports
Gas/Vacuum Ports
Quick-Fit, 6 mm ID
1/8” Swagelok®
UpIR –
Upward Looking Diffuse Reflectance Accessory
Features
• Upward-looking optics provide fast and easy analysis of
samples placed face down on the sample port
• Out-of-compartment design for analysis of large samples
• High optical throughput and exceptional signal-to-noise ratio
• Analysis of powders, ground solid samples and coatings on
metallic surfaces
All mirrors, including the ellipsoidal collection mirror, are
permanently mounted. The position of the sampling stage is
controlled with an adjustable micrometer to achieve the best
possible throughput. Spectral analysis involves collecting a
background spectrum with the reference mirror in the sampling
position. After this step, the sample is simply placed face down
onto the sampling port and data collection is initiated.
The gold-coated optics version of the UpIR provides the highest
throughput in the mid-IR spectral region and is recommended for
NIR sampling. The UpIR accessory includes a solids sampling plate
for flat samples, a ZnSe-windowed sampling cup for powders or
small solids analysis and a 4-piece mask set (aperture diameters of
10, 7, 5 and 3 mm). The accessory is equipped with purge tubes for
elimination of CO2 and water interferences from infrared spectra.
For NIR sampling of solids, powders or tablets, the sapphirewindowed sampling cup is recommended. In the NIR spectral region
samples can be analyzed while contained in a glass vial; the optional
21-mm glass vial holder is recommended.
reproducible, high-quality data
• Micrometer-controlled sample stage positioning and focusing
• Optional gold-coated optics version for highest
performance mid-IR and NIR applications
UpIR – Out-of-Compartment Diffuse Reflectance Accessory
Includes solids sampling insert or powders sampling insert
with ZnSe window, mask set, gold mirror, purge tubes,
purge kit and spectrometer baseplate
044-60XXUpIR – Out-of-Compartment Diffuse Reflectance Accessory
with Gold-Coated Optics
Includes solids sampling insert or powders sampling insert
with ZnSe window, mask set, gold mirror, purge tubes,
purge kit and spectrometer baseplate
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
U p IR O ptions
Part Number Description
044-3030
Solids Sampling Insert
044-3040
Powders Sampling Insert (order window separately)
044-3010
Glass Vial Holder, 21 mm
044-3020Sample Vials with Threaded Caps, 21 mm x 70 mm (200 ea.)
044-3050
UpIR Mask Set
160-1155
Window, ZnSe, 25 x 2 mm
160-1307
Window, Ge, 25 x 2 mm
160-1201
Window, AMTIR, 25 x 2 mm
160-5000
Window, Sapphire, 25 x 2 mm
048-3000
Diffuse Gold Reference
608-274-2721
Optical geometry
for the UpIR.
044-10XX
www.piketech.com
The UpIR is an innovative FTIR accessory developed to support
a wide range of diffuse reflectance applications. To make
measurements, simply place large, solid samples face down onto
the top plate of the accessory. Powders can be placed into a suitable
sampling cup at the top of the UpIR. A mask set is included for the
analysis of small solids such as gems and precious stones.
This design is uniquely suitable for mid-IR analysis of coatings
on metallic surfaces of large or small samples. For this application,
analysis is rapid and easy because no sample preparation or cleanup
is required. Since the sampling area of the UpIR is above the plane
of the FTIR instrument, even large samples that do not fit into the
sample compartment can be analyzed with this accessory.
The accessory is equipped with an upward-looking, highperformance ellipsoidal mirror. The sampling stage provides a
sampling port with inserts for diffuse reflectance or specular
reflectance measurements.
O r d e r i n g I n fo r m a t i o n
Part Number Description
Pike Technologies
• Pre-aligned, fixed-position optical components for
D iffuse R eflectance
Analysis of a large painted metal panel using the UpIR accessory.
44
From Powders to Plastic Bumpers
AutoDiff –
Automated Diffuse Reflectance Sampling
Features
• Complete automated diffuse reflectance accessory
and software package for unattended analysis of
up to 60 samples
• High-performance optical design collects maximum
amount of diffusely reflected energy and provides
high-quality spectra in a short time period
• Flexible sample sequencing and background collection
to provide maximum sampling efficiency and greatly
minimize atmospheric contributions to sample spectra
• Easily programmable AutoPRO software delivers automated
sample collection
• Easily removable sample tray to speed sample loading
and unloading
The AutoDiff is a high-performance, automated diffuse reflectance
accessory developed to analyze multiple samples with minimal user
intervention. Typical applications include powdered pharmaceutical
samples, high-throughput forensic sampling, kidney stone analysis,
soils analysis and analysis of many other powdered samples where
speed and efficiency are important. The design employs an
automated R-theta sampling stage providing diffuse reflectance
analysis with greatly reduced operator intervention and increased
sample throughput.
The optical design of the AutoDiff utilizes a high-efficiency
fixed ellipsoidal reflector to collect the maximum amount of
diffusely reflected energy from the sample. Other optical components important to achieving this high performance are aligned
and permanently located. The accessory is baseplate-mounted in
the FTIR spectrometer sample compartment and can be purged
independently or it can use the spectrometer’s purge.
Spectral quality and reproducibility are excellent with the
AutoDiff. By programming the collection of spectra at precise
time periods and alternating sample and background collection,
any effects of atmosphere are greatly reduced.
The PIKE AutoDiff fully automates diffuse reflectance FTIR
spectroscopy. The sample holder contains positions for 60 samples,
plus a center position for a background sample, which usually
consists of pure KBr powder.
The sample plate is marked into
six areas, labeled from A to F. Each
area has ten sample positions marked
from 1 through 10. This sample
position numbering scheme is also
used within the software for describing
and positioning the samples.
The AutoDiff is controlled by PIKE
AutoPRO software which incorporates
multi-operator sample submission. The
system is extremely flexible and the
graphical user interface is intuitive
and simple. Multiple operators may independently log samples
onto the system. The AutoPRO software integrates easily with
most commercially-available FTIR software packages.
The AutoDiff is also available with gold-coated optics for
highest performance mid-IR analysis and for automated NIR
diffuse reflectance sampling.
O r d e r i n g I n fo r m a t i o n
Part Number Description
043-28XX
AutoDiff – Automated Diffuse Reflectance System
Includes motion control unit (85/265 VAC), AutoPRO software
60-position sample mounting tray, 60 macro sample cups and
Sample Preparation Kit
043-78XXAutoDiff – Automated Diffuse Reflectance System with
Gold-Coated Optics
Includes motion control unit (85/265 VAC), AutoPRO software,
60-position sample mounting tray, 60 macro sample cups and
Sample Preparation Kit
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
R eplacement P arts and O ptions
Part Number Description
043-3090
AutoDiff Sampling Cups, macro (60 ea.)
043-3085
AutoDiff Sampling Cups, micro (60 ea.)
043-0900
AutoDiff 60-Position Sampling Tray
042-2010
Sample Cup, micro, 6.0 mm diameter, 1.6 mm deep (2 ea.)
042-2020Sample Cup, macro, 10 mm diameter, 2.3 mm deep (2 ea.)
Spectra of pharmaceuticals using the AutoDiff accessory.
45
042-3010
Abrasion Sampling Kit
042-3020
Abrasion Disks, silicon carbide (100 ea.)
042-3025
Abrasion Disks, diamond (50 ea.)
042-3080
Alignment Mirror, aluminum
042-3082 Alignment Mirror, gold
XY Autosampler – Transmission and Reflection, Automated
Sampling in Microplate Format
Features
• Complete hardware and software package for automated
analysis with standard 24-, 48-, or 96-well plates. Special
configurations available.
Specifications
Optics
Elliptical – 3X beam demagnification
• Diffuse reflectance of powdered samples or specular
Accuracy
+/- 25 µm
• Gold-coated optics version for highest performance mid-IR
Repeatability Resolution
• Optional transmission sampling with integrated DTGS or
Minimum Run Time56 seconds for 96-well plate
(actual time is spectrometer and
application dependent)
• Fully enclosed, purgeable design with CD-style loading tray
• In-compartment mounting, compatible with most FTIR
Computer InterfaceUSB
reflectance sampling for reaction residues
and NIR sampling
Mechanical Specifications
InGaAs detector and transmission sampling plate
spectrometers
+/- 5 µm
1 µm
Dimensions (W x D x H)6.25 x 13.2 x 5.55”
(including micrometer)
Weight
10 lbs
O r d e r i n g I n fo r m a t i o n
Part Number Description
047-21XX
XY Autosampler – Diffuse Reflectance
047-61XX
XY Autosampler – Diffuse Reflectance with Gold-Coated Optics
047-22XX
XY Autosampler – Diffuse Reflectance/Transmission
with integrated DTGS detector
047-23XX
XY Autosampler – Diffuse Reflectance/Transmission
with integrated InGaAs detector
047-63XXXY Autosampler – Diffuse Reflectance/Transmission with
Gold-Coated Optics with integrated InGaAs detector
O ptions
Part Number Description
073-9110
96-Well Diffuse Reflectance Sampling Plate
073-9130
073-9160
96-Well Si Transmission Sampling Plate
24-Well Diffuse Reflectance Sampling Plate for
Disposable Cups
162-1920
Disposable Cups (50 ea.)
608-274-2721
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
All XY Autosamplers include PIKE AutoPRO software and a 96-well sampling plate.
Diffuse Reflectance/Transmission versions include a 96-well plate for diffuse
reflectance and a 96-well plate for transmission. For other options please contact
PIKE Technologies. For transmission option, your spectrometer must be capable of
interfacing with an external detector. A glass-bottom well plate is recommended for
NIR transmission measurements.
www.piketech.com
047-62XXXY Autosampler – Diffuse Reflectance/Transmission
with Gold-Coated Optics with integrated DTGS detector
Pike Technologies
The PIKE Technologies XY Autosampler is designed around
standard 24-, 48- or 96-well microplate architectures – ideal for
high-efficiency sample loading and FTIR analysis. The loading tray
moves to a position outside of the accessory for easy loading and
unloading of samples while conserving the purge. This also permits
interface to a robot/autoloader.
Applications include high throughput analysis of liquid residues
and chemical reactions, powdered samples, and automated diffuse
reflection analysis. The XY Autosampler is available with standard
aluminum optics or with gold-coated optical components for highest
performance in mid-IR and optimized NIR sampling.
The XY Autosampler features an X, Y stage with both axes driven
by high-precision servo motors with optical encoders for speed
and reproducibility. USB and DC power are the only external
connections required for this accessory. The transmission option
requires an external IR detector port.
Programming and control of the XY Autosampler is done
through PIKE Technologies’ AutoPRO software, which can be
integrated easily with most FTIR software packages.
The optical design of the XY Autosampler is based upon a
precision ellipsoidal reflector. The size of the spot illuminated
at the sample is approximately 2 mm which is ideal for up to
96-well configurations. The accessory is compatible with most
FTIR spectrometers.
A special silicon well plate is available for mid-IR sample
analysis by transmission. This unique 96-well plate allows collection
of transmission spectra in mid-IR range. For diffuse reflection
measurements a dedicated plate is available. The plate features
96 polished cavities for placement of powder samples. Please
contact PIKE Technologies if you require specialized sampling
plate configurations.
D iffuse R eflectance
High-quality FTIR spectra of
solvent residues collected with
the XY Autosampler.
46
From Powders to Plastic Bumpers
Sample Preparation and Loading Kit –
The Easiest Way to Work With Powder Samples
The Sample Preparation and Loading Kit makes the handling of
powder samples for diffuse reflectance sampling easy. It includes a
round mounting base and a matching tray with an opening which
accommodates sampling cups. The cup is placed in the assembly
and overfilled with sample, and then excess powder is leveled-off
with a spatula. The overflow is retained on the tray and can be
easily returned to the sample container or disposed.
Two standard sampling cups offer 0.18 and 0.03 cubic centimeter
capacities (10-mm diameter, 2.3-mm deep and 6.0-mm diameter, 1.6mm deep). The required approximate weight of the sample/KBr mixture is 450 mg for the large cup and 80 mg for the small one.
O r d e r i n g I n fo r m a t i o n
Part Number Description
042-3040
Sample Preparation and Loading Kit
Includes 2 micro and 2 macro cups, alignment mirror,
sampling cup holder and base, 2 spatulas, brush
042-2010
Sample Cup, micro, 6-mm diameter, 1.6-mm deep (2 ea.)
042-2020
Sample Cup, macro, 10-mm diameter, 2.3-mm deep (2 ea.)
042-3030
Delrin® Sampling Cup Holder and Base
042-3080
Alignment Mirror, aluminum
042-3082 Alignment Mirror, gold
042-3070
Camel Hair Brush
042-3035
Spatula, spoon
042-3050
Spatula, flat
160-8010
KBr Powder (100 g)
Note: The Sample Preparation and Loading Kit is included with EasiDiff, DiffusIR
and AutoDiff diffuse reflectance accessories.
Abrasion Sampling Kit – The Plastic Bumper Sampler
The Abrasion Sampling Kit consists of a sample collector tool and
a set of silicone carbide (SiC) and diamond disks. Sampling is
performed by abrading the surface of the investigated substance
with a selected disk. The disk is placed in the accessory and a
diffuse reflectance spectrum of the material is collected. This
method is particularly useful for the analysis of large painted
surfaces (e.g. car panels) and other awkward objects.
• Convenient set of tools for collection of difficult solid samples
• Rigid construction, diamond and silicon carbide disks
O r d e r i n g I n fo r m a t i o n
Part Number Description
47
042-3010
Abrasion Sampling Kit
Includes sample collector tool with stainless steel flat
sample post, 75 SiC disks and 25 diamond abrasion disks
042-3020
Abrasion Disks, silicon carbide (100 ea.)
042-3025
Abrasion Disks, diamond (50 ea.)
042-3060
Flat Sample Post
Diffuse Reflectance – Theory and Applications
Diffuse Reflectance – Ideal for Powdered Samples
and Intractable Solids
How Diffuse Reflectance Works
Diffuse reflectance relies upon the focused projection of the
spectrometer beam into the sample where it is reflected, scattered
and transmitted through the sample material (shown below). The
back reflected, diffusely scattered light (some of which is absorbed
by the sample) is then collected by the accessory and directed to
the detector optics.
Other factors related to high spectral quality for diffuse
reflectance sampling are listed below.
• Particle Size – reducing the size of the sample particles reduces
the contribution of reflection from the surface. Smaller particles
improve the quality of spectra (narrow bandwidths and better
relative intensity). The recommended size of the sample/matrix
particles is 50 microns or less (comparable to the consistency of the
finely ground flour). This fine powder is easily achieved by using the
PIKE Technologies ShakIR ball mill.
• Refractive Index – effects result in specular reflectance contributions (spectra of highly reflecting samples will be more
distorted by the specular reflectance component). This effect
can be significantly reduced by sample dilution.
• Homogeneity – samples prepared for diffuse reflectance
measurements should be uniformly and well mixed. Nonhomogenous samples will lack reproducibility and will be
difficult to quantify. An ideal way to mix samples for diffuse
reflectance is by using the PIKE Technologies ShakIR.
• Packing – the required sample depth is governed by the amount
of sample scattering. The minimum necessary depth is about
1.5 mm. The sample should be loosely but evenly packed in
the cup to maximize IR beam penetration and minimize
spectral distortions.
www.piketech.com
Only the part of the beam that is scattered within a sample
and returned to the surface is considered to be diffuse reflection.
Some powders may be analyzed by diffuse reflectance as
neat samples (coal samples, soil samples, diffuse coatings on a
reflective base). Usually, the sample must be ground and mixed
with a non-absorbing matrix such as KBr. The sample to matrix
ratio is generally between 1 to 5% (by weight). Diluting ensures a
deeper penetration of the incident beam into the sample which
increases the contribution of the scattered component in the
spectrum and minimizes the specular reflection component.
The specular reflectance component in diffuse reflectance
spectra causes changes in band shapes, their relative intensity,
and, in some cases, it is responsible for complete band inversions
(Restrahlen bands). Dilution of the sample with a non-absorbing
matrix minimizes these effects (particle size and sample loading
mechanics also play an important role).
Diffuse reflective spectra showing greatly improved results from
sample dilution.
Pike Technologies
.. Incident
Radiation
Diffuse Reflection
. Specular Reflection
D iffuse R eflectance
Diffuse reflectance is an excellent sampling tool for powdered or
crystalline materials in the mid-IR and NIR spectral ranges. It can
also be used for analysis of intractable solid samples. As with
transmission analysis, samples to be run by diffuse reflectance are
generally ground and mixed with an IR transparent salt such as
potassium bromide (KBr) prior to sampling. Diffuse reflectance is
an excellent sampling technique as it eliminates the time-consuming
process of pressing pellets for transmission measurements. Diffuse
reflectance can also be used to study the effects of temperature
and catalysis by configuring the accessory with a heating or cooling
environmental chamber.
Perhaps one of the greatest additional benefits of diffuse
reflectance sampling is that it is ideally amenable to automation.
Methods can be developed with a manual version diffuse reflection
accessory and then moved to automation to increase sample
throughput. PIKE Technologies offers several diffuse reflectance
accessory configurations – basic, advanced with heat chamber
capabilities, upward directed IR beam for easy sampling access and
fully automated for maximum sampling efficiency.
This is shown below in the spectral data for caffeine, where
the upper spectrum is diluted to about 2% by weight in KBr and
demonstrates very high quality with sharp, well-defined
absorbance bands. The lower spectrum is of undiluted caffeine
measured by diffuse reflectance and shows derivative-shaped
bands in the 1700 cm-1 and 1500 cm-1 region of the data. The upper
spectrum of diluted caffeine is clearly of higher spectral quality than
that of the undiluted caffeine.
608-274-2721
48
From Powders to Plastic Bumpers
The figure below shows the diffuse reflectance spectrum of an
automotive body component. The PIKE Abrasion Sampling Kit with
diamond sampling disk was rubbed across the large automotive
component which collects some of the polymer material into the web
of the sampling disk. Spectra were co-added for 1 minute and ratioed
to the diamond disk background spectrum. The resulting spectrum is
of excellent quality and is identified as a polypropylene copolymer.
Diffuse reflectance can also be used for the analysis of liquid
samples. In this application a small amount of the sample is
dispensed directly onto the KBr powder and analyzed.
Diffuse reflectance spectra of ibuprofen with Kubelka-Monk conversion
compared to a transmission spectrum.
Even with all these sample preparation practices, the raw
diffuse reflectance spectra will appear different from its transmission
equivalent (stronger than expected absorption from weak IR bands).
A Kubelka-Munk conversion can be applied to a diffuse reflectance
spectrum to compensate for these differences. This conversion is
available in most FTIR software packages.
The Kubelka-Munk equation is expressed as
Diffuse reflectance spectrum using diamond abrasion disk.
where R is the absolute reflectance of the sampled layer, k is the
molar absorption coefficient and s is the scattering coefficient.
The spectra shown above demonstrate this spectral conversion
for ibuprofen collected by diffuse reflectance. The sample was
diluted to about 1% by weight in KBr and mixed using the ShakIR.
The Kubelka-Munk converted spectrum for ibuprofen shows
excellent comparison with the transmission spectrum and is easily
identified using library search of a transmission spectral database.
The Kubelka-Munk equation creates a linear relationship for
spectral intensity relative to sample concentration (it assumes
infinite sample dilution in a non-absorbing matrix, a constant
scattering coefficient and an “infinitely thick” sample layer). These
conditions can be achieved for highly diluted, small particle samples
(the scattering coefficient is a function of sample size and packing)
and a sample layer of at least 1.5 mm. With proper sample
preparation, diffuse reflectance spectroscopy can provide ppm
sensitivity and high-quality results.
For the analysis of powders the following procedure is recommended;
Plastic Bumpers and Tough Samples
• Move the holder to the sample position and collect a sample
spectrum (the ratio of these two spectra will produce a
spectrum of the sample)
Sometimes it is necessary to analyze a sample which simply does
not fit in a spectrometer’s sample compartment – the analysis of
polymer-based automotive components or painted panels are
typical examples.
A special diffuse reflectance technique allows quick and simple
analysis of such samples in a relatively non-destructive manner.
A small amount of the sample can be collected by abrasion on
a diamond or silicon carbide abrasion disk and analyzed
immediately with the help of a diffuse reflectance accessory.
Heavy-duty sample collecting tool
with diamond abrasion disk on
removable sample post
49
• Place about 200–400 mg of KBr into the ShakIR vial with a stainless
steel ball and grind for 30 seconds
• Fill the background diffuse cup with this KBr
• Remove excess KBr with a flat edge – the KBr should be
loosely packed
• Add 1 to 5 mg of the sample to the remaining KBr in the
ShakIR vial and mix for 30 seconds
• Fill the sample diffuse cup with this mixed sample/KBr
• Remove excess sample with a flat edge – the sample should
be loosely packed
• Place the background and sample diffuse cups into the
sample holder
• Slide the sample holder into the accessory
• Position the KBr cup in the beam and collect a background
• Convert the raw diffuse reflectance spectrum to Kubelka-Munk
Under ideal conditions the transmission of the strongest band
in the spectrum should be in the 50% range. If the resulting bands
are too intense or distorted, further dilute the sample and make
sure that all other measurement affecting factors (particle size,
homogeneity and packing) are within required limits.
Summary
Diffuse reflectance accessories make the analysis of a wide range
of solid samples easier, faster and more efficient. Advanced options
for diffuse reflectance provide the ability to heat and cool the
sample and monitor a reaction process. Automation versions of
diffuse reflectance accessories provide the ability to greatly increase
sample throughput.
Specular Reflectance
Specular reflectance sampling represents a very important
technique useful for the measurement of thin films on reflective
substrates, the analysis of bulk materials and the measurement of
mono-molecular layers on a substrate material. Often this technique
provides a means of sample analysis with no sample preparation –
keeping the sample intact for subsequent measurements.
VeeMAX III™ Page 50
Variable Angle Specular Reflectance Accessory
Measurement of thin films and monolayers
10Spec™ Page 52
Fixed 10 Degree Angle of Incidence
Near-normal sample reflectivity measurement
30Spec/45Spec™ Page 53
Fixed 30 or 45 Degree Angle of Incidence
Thick films analysis
80Spec™ Page 54
Fixed 80 Degree Angle of Incidence
Measurement of thin films and mono-molecular layers
AGA™ Page 55
Advanced Grazing Angle Accessory
Thin films requiring precise spot size control
Absolute Reflectance Accessory Page 56
Measurement of optical surfaces, windows
and metallic surfaces
Theory and
A pplications
Page 57
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
VeeMAX III –
The Ultimate Variable Angle Specular Reflectance Accessory
Thin Films and More
optimized by varying the angle of incidence from 30 to 80 degrees.
Changing the angle is as easy as turning the angle selector on the
front panel of the accessory.
To make measurements, the sample is placed face down on the
sampling surface. Designed for unrestricted access to the sampling
area, large samples may be readily analyzed. Thanks to the optical
design of this accessory and the quality of the optics, excellent
throughput is realized even at high angles of incidence. All powered
mirrors are diamond turned for optimal performance.
Features
• Selectable angle of incidence – from 30 to 80 degrees in
1 degree increments
• Measurement of thin films and monolayers to relatively
Proprietary beam path within the VeeMAX III specular reflectance accessory.
thick films
• Optimize specular reflectance results with selectable angle
of incidence
• Integrated position for IR polarization – essential for
monolayer analysis and study of polymer orientation
• Optional single reflection ATR crystals – see ATR section
• Motorized option with AutoPRO software for automated,
high-precision experiments
• Sealed and purgeable optical design to eliminate water
vapor and carbon dioxide interferences
The PIKE Technologies VeeMAX III is a high-performance researchgrade specular reflectance accessory. Its unique variable angle
optical design (U.S. Patent No. 5,106,196) makes it a key accessory
to analyze a wide range of samples. Typical VeeMAX III applications
include depth profiling, analysis of monolayers and ultra-thin films,
determination of polymer orientation and spectroelectrochemistry.
From monolayers to relatively thick films, all experiments may be
To suit different sample geometries, masks with 2”, 5/8” and
3/8” apertures are provided. Another important design feature of
the VeeMAX III is its enclosed optics for purging, which eliminates
the need to purge the entire sample compartment. This significantly
decreases sampling time. It is furnished with two polarizer mounts
allowing the PIKE polarizer to be inserted into the accessory on
either the source or detector side of the spectrometer. The polarizer
setting dial is easily accessed while never breaking the purge when
changing polarizer orientation.
To further expand on the versatility of the VeeMAX III, the
accessory may be fitted with an ATR flat plate allowing for variable
angle ATR experiments. Please see the ATR section of our catalog for
complete configuration options.
FTIR spectrum of thiol monolayer measured using the VeeMAX III
specular reflectance accessory set at 80 degrees angle of incidence,
ZnSe polarizer and MCT detector.
51
Optimization of the analysis of a multi-layered coating on metal
substrate using the VeeMAX III.
Specifications
Optics
All reflective
Angle of Incidence Range
30 to 80 degrees
Sample Masks
2”, 5/8” and 3/8”
Purge Sealing
Purge tubes and purge barb included
Dimensions (W x D x H)177 x 92 x 162 mm (excludes baseplate)
FTIR Compatibility
Most, specify model and type
• Computer-controlled precision, accuracy and repeatability
Spectroelectrochemical
Vessel Dimensions
25 mm dia tapering to 19 mm, 25 mm tall
• Synchronization of mirror position changes with collection of
sample spectra
Spectroelectrochemical
Vessel Volume
7.5 mL
• Tailor-made, predefined experiments
Spectroelectrochemical
Vessel Material
PTFE or PEEK
• “Hands-free” operation
O r d e r i n g I n fo r m a t i o n
Part Number Description
013-11XX
VeeMAX III
Includes sample masks (2”, 5/8” and 3/8”), gold substrate
alignment mirror, FTIR base mount, and purge tubes
013-12XX
Automated VeeMAX III
Includes controller, cabling, sample masks (2”, 5/8” and 3/8”), gold substrate alignment mirror, FTIR base mount,
and purge tubes
S pecular R eflectance
An optional automated version of the VeeMAX III accessory is
available. It features a servo motor with USB interface and PIKE
Technologies AutoPRO software. Operation of the VeeMAX III can be
integrated with the spectrometer software of most FTIR instruments,
which allows the operator to precisely and reliably control a wide
range of angles of incidence and data collection simultaneously
from a computer keyboard. Automated sampling decreases operator
error and increases workflow productivity. Other advantages of an
Automated VeeMAX III accessory include
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
V ee MAX III S ampling O ptions
Part Number Description
AutoPRO Software configured for the
VeeMAX III with automated polarizer.
Manual Polarizer, ZnSe
090-1200
Manual Polarizer, KRS-5
090-3000
Precision Manual Polarizer, ZnSe
090-3200
Precision Manual Polarizer, KRS-5
090-5000
Precision Automated USB Polarizer, ZnSe
090-5100
Precision Automated USB Polarizer, KRS-5
Note: Automated version includes PIKE Technologies AutoPRO software and
controller. More polarizer options are found in the polarizer section of this catalog.
V ee MAX III R eplacement P arts
Pike Technologies
A spectroelectrochemical cell option for the VeeMAX III is also
available. The cell allows for specular experiments using a flat IR
window or CaF2 prism, where the beam reflects off the working
electrode or for ATR experiments where often the ATR crystal serves
as the working electrode. Windows and ATR crystals are removable.
The electrochemistry cell is equipped with a precision micrometer
for electrode positioning.
090-1000
Part Number Description
Specular Mask Set
300-0002
Gold Substrate Alignment Mirror, 1.25 x 3.0”
Note: Please contact PIKE Technologies for items not described in this list.
S pectroelectrochemical C onfigurations
Part Number Description
Electrochemical Cell – PTFE
013-3370
Electrochemical Cell – PEEK
160-5527
Prism, CaF2, 60 degree
013-3360
Crystal Holder, 60 degree
160-1144
Flat Window, CaF2, 20 x 2 mm
160-1304
Flat Window, ZnSe, 20 x 2 mm
013-3320
Flat Window Holder
Notes: The electrochemical configuration requires Electrochemical Cell and
VeeMAX III specular reflectance accessory. Must select one or more windows.
Choose appropriate window holder. More window types for specular reflectance
measurements may be found in our listing of transmission windows, 20 mm x 2 mm.
Electrodes supplied by the end-user. See VeeMAX III with ATR product sheet for full
ATR crystal and configuration options.
608-274-2721
Electrochemical Cell assembly for VeeMAX III.
013-3300
www.piketech.com
013-4010
52
Thin Films and More
10Spec –
Near-normal Sample Reflectivity Measurements
FTIR spectrum measuring the reflectively of glass with the 10Spec.
Standard 10Spec (above)
and Extended Height
10Spec (left)
The PIKE Technologies 10Spec is an optimized specular
reflectance accessory designed to make high-performance
measurements of sample reflectivity. It produces a collimated beam
to illuminate the sample area such that the reflectivity measurement
is made at a uniform 10 degree angle of incidence and not an
average of angles produced by a focused beam accessory design.
At a near-normal angle, the polarization effects on reflectivity are
minimized. The optics are enclosed to allow for purging.
The 10Spec is recommended to measure the reflectivity of
glass. It may also be used to measure near-normal reflectivity of a
wide variety of surfaces including military devices, reflecting optics,
anti-reflective (AR) coated surfaces, and other reflecting and nonreflecting materials.
The 10Spec is available in two versions. The standard version
is 118-mm tall whereas the Extended Height 10Spec is 205-mm tall,
which positions the sample above the top of the FTIR instrument. The
Extended Height 10Spec is designed to accommodate samples that are
too large to fit within the confinements of the sample compartment.
Features
• Measure sample reflectance
• Fixed 10 degree angle of incidence
• Sample illumination using collimated beam precisely
fixed at 10 degrees
• Sampling mask sizes of 2”, 5/8” and 3/8”
• Purge cover and purge tubes for removal of atmospheric
interferences
• Extended Height 10Spec to accommodate large samples
Specifications
Optics
All reflective
Angle of Incidence 10 degrees
Sample Masks
2”, 5/8” and 3/8””
Purge Sealing
Purge tubes and purge barb included
Dimensions (W x D x H)
Standard
159 x 90 x 118 mm (excludes baseplate)
Extended Height
159 x 90 x 205 mm (excludes baseplate)
FTIR Compatibility
Most, specify model and type
O r d e r i n g I n fo r m a t i o n
Part Number Description
010-10XX
10Spec – 10 Degree Specular Reflectance Accessory
Includes 3 sample masks (2”, 5/8” and 3/8”), gold substrate
alignment mirror and FTIR base mount
010-11XXExtended Height 10Spec Accessory
Includes 3 sample masks (2”, 5/8” and 3/8”), gold substrate alignment mirror and FTIR base mount
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
10S pec R eplacement P arts and S ampling O ptions
Part Number Description
Beam path within the 10Spec specular reflectance accessory.
53
010-3010
Specular Mask Set
300-0002
Gold Substrate Alignment Mirror (1.25” x 3.0”)
30Spec and 45Spec –
Specular Reflectance for Thick Films
Features
• Measurement of thick films
• Measurement of film thickness by specular reflectance
• Fixed 30 degree angle of incidence
• Special version – 45Spec for 45 degree angle of incidence
• Sample masks to define sampling area
• Slide-mount design for easy installation of accessory –
fits all FTIR spectrometers
FTIR spectrum of polymer coating on a food container collected using the
PIKE 30Spec.
Specifications
Optics
All reflective
Angle of Incidence 30 degrees or 45 degrees
Sample Masks
3/8”, 1/4” and 3/16”
51 x 96 x 77 mm
Mount
2” x 3” slide mount
O r d e r i n g I n fo r m a t i o n
30Spec – 30 Degree Specular Reflectance Accessory
Includes sample masks (3/8”, 1/4”, and 3/16”), alignment
mirror and slide-mount
011-4500
45Spec – 45 Degree Specular Reflectance Accessory
Includes sample masks (3/8”, 1/4”, and 3/16”), alignment
mirror and slide-mount
Note: The 30Spec and 45Spec are slide-mount accessories.
30S pec and 45S pec S ampling O ptions
Part Number Description
011-2010
Sample Masks (3/8”, 1/4”, and 3/16”)
300-0039
Aluminum Alignment Mirror
www.piketech.com
011-1000
Pike Technologies
Dimensions (W x D x H)
Part Number Description
Optical geometry for the 30Spec.
S pecular R eflectance
The PIKE Technologies 30Spec is ideal for the measurement of
relatively thick films by specular reflectance. Samples are simply
laid across the top of the accessory and the spectrum of the film
is measured within a short time period. The 30Spec includes sample
masks of 3/8”, 1/4” and 3/16” to define specific sampling areas.
The 30Spec provides high-quality FTIR spectra for identification of
coatings and can also be used to measure coating thickness. IR
throughput is high using the 30Spec due to its relatively simple
optical design.
Note: Sample masks and alignment mirror fit both 30Spec and 45Spec.
608-274-2721
54
Thin Films and More
80Spec –
Grazing Angle Specular Reflectance for Thin Films
The PIKE Technologies 80Spec is ideal for the measurement of
relatively thin films and mono-molecular layers by specular
reflectance. Samples are simply placed face down across the top of
the accessory and the spectrum of the film is collected. Generally
the measurement of ultra-thin film samples, especially monolayers,
is significantly enhanced by using p-polarized light, with the electric
field vector perpendicular to the sample surface. The 80Spec
includes polarizer mounts on both incoming and outgoing beams
for positioning optional manual or automated IR polarizers from
PIKE Technologies.
The 80Spec is available in two versions. The basic configuration
features a flat sampling surface with fixed sampling port. This
version is ideal for analysis of larger, uniform samples. The second
version includes three sample masks to define smaller areas
on a sample, and is recommended for smaller samples or for
measurement of variations in thin film coatings.
Features
• Measurement of thin films and mono-molecular layers
• Fixed 80 degree angle of incidence
• Gold-coated reflective optics for highest throughput
grazing angle analysis
• Dual polarizer mounts for incoming and outgoing IR beam
• Optional sample masks version to define unique sampling areas
• Baseplate mount design for stable operation and collection
of high-quality spectra – fits all FTIR spectrometers
FTIR spectrum of an ultra-thin film on a reflective substrate using
p-polarized IR beam.
O r d e r i n g I n fo r m a t i o n
Part Number Description
012-10XX
80Spec – 80 Degree Specular Reflectance Accessory
Includes a gold substrate alignment mirror, dual polarizer
mount and FTIR base mount
012-11XX80Spec – 80 Degree Specular Reflectance Accessory
with Sample Masks (2”, 5/8” and 3/8”)
Includes a gold substrate alignment mirror, dual polarizer
mount and FTIR base mount
Beam path within the 80Spec specular reflectance accessory.
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
For compact-size spectrometers, only one polarizer mount may be included due to
sample compartment width restriction. Please contact PIKE Technologies prior to
placing an order.
R eplacement P arts and O ptions
Part Number Description
010-3010
Specular Mask Set
300-0002
Gold Substrate Alignment Mirror, 1.25 x 3.0”
090-1000
Manual Polarizer, ZnSe
090-1200
Manual Polarizer, KRS-5
090-3000
Precision Manual Polarizer, ZnSe
090-3200
Precision Manual Polarizer, KRS-5
090-5000
Precision Automated USB Polarizer, ZnSe
090-5100
Precision Automated USB Polarizer, KRS-5
Note: For more polarizer options see the polarizer section of this catalog.
55
AGA – Advanced Grazing Angle Specular Reflectance
for Thin Films with Precise Spot Control
Features
• Quantitative measurement of small areas of thin films and
The beam from the spectrometer is focused onto the pin
mirror. The angle of incidence is equal to 80 degrees. The portion
of the beam that is reflected from this mirror is imaged at unit
magnification onto the sample, striking it at the same 80 degrees.
Thus, the beam at the sample position is uniform and circular in
dimension – providing excellent quantitative results for the
defined sample area.
mono-molecular layers
S pecular R eflectance
Beam path within the AGA – Grazing Angle Specular Reflectance Accessory.
• Fixed 80 degree angle of incidence
• Measurement of lubricants on hard disks
• Sampling dimensions selectable from 1/2”, 3/8”, 1/4”,
3/16” and 1/8” diameter
• Polarizer mount for optional polarizer
• Baseplate mount design for stable operation and collection
of high-quality spectra – fits most FTIR spectrometers
• Spectral range 10,000–500 cm-1
FTIR spectrum of an 18-angstrom thick lubricant on a hard disk
measured in 15 seconds using an MCT detector.
O r d e r i n g I n fo r m a t i o n
Part Number Description
AGA – Grazing Angle Specular Reflectance Accessory
Includes 5 selectable spot sizes of 1/2”, 3/8” 1/4”, 3/16”
and 1/8”, gold substrate alignment mirror, polarizer
mount and FTIR base mount
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
R eplacement P arts and S ampling O ptions
Part Number Description
The size and shape of the illuminated spot on the sample is
defined by the optics contained in the accessory. The AGA optical
design uses primary imaging from one of five user-defined, slidemounted pin mirrors selectable from 1/2” to 1/8”.
Gold Substrate Alignment Mirror, 1.25 x 3.0”
090-1000
Manual Polarizer, ZnSe
090-1200
Manual Polarizer, KRS-5
Note: For more polarizer options see the polarizer section of this catalog.
608-274-2721
Sampling image on a hard disk surface produced by (A) the spatially
resolved AGA and (B) a traditional grazing angle accessory.
300-0002
www.piketech.com
015-10XX
Pike Technologies
The PIKE Technologies AGA – Advanced Grazing Angle Specular
Reflectance Accessory is a novel instrument designed for quantitative
measurement of spatially defined areas of thin films on reflective
substrates. Traditional grazing angle accessories produce a
sampling area which is elliptical in shape and non-uniformly
illuminates the sample area. This large asymmetrical sampling
area causes problems when quantitative analysis are to be
performed on small sample areas. The Advanced Grazing Angle (AGA)
Accessory has been designed to overcome this deficiency.
56
Absolute Reflectance Accessory –
Measure Absolute Sample Reflectance
Thin Films and More
Reference
Mirror
Sample
Reference
Mirror
V Position
Collect Background
W Position
Measure Sample
Beam path for V and W positions for the PIKE Absolute Reflectance
Accessory.
Features
• For the measurement of absolute reflectance of optical
surfaces, windows and metallic surfaces
• Performance evaluation of optical elements
• Evaluation of test plates in medical, industrial and military
applications
• Fixed 12 degree angle of incidence
Sample reflectance is usually measured in comparison to a highreflectance diffuse gold or specular gold mirror. The sample
reflectance is measured and calculated against these standards that
have 94–99% reflectance in the infrared region.
Absolute reflectance measurement has to be even more
accurate than measured by other relative specular accessories.
Unfortunately, no standards exist today that have guaranteed 100%
reflectance, against which unknown samples could be compared.
PIKE Technologies has developed an Absolute Reflectance Accessory
which does not require reflectance standards due to its unique
V / W optical arrangement. The beam in the V position reflects
from the reference mirror. In the W position it is reflecting from
the sample twice and the same reference mirror at 12 degrees.
The absolute reflectance of a sample is the square root of the
measured value at a given wavenumber or wavelength. The two
configurations are easily selected by rotating the sample holder
180 degrees with its pinned-in-place mount and the sample is held
by a quick-release mount.
Spectrum of a silicon plate measured in the PIKE Absolute Reflectance
Accessory.
O r d e r i n g I n fo r m a t i o n
Part Number Description
014-10XXAbsolute Reflectance Accessory
Includes V / W sample holder, gold substrate mirror
and FTIR base mount
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
R eplacement P arts and S ampling O ptions
Part Number Description
Specifications
57
300-0061
Optics
All reflective
Angle of Incidence 12 degrees
Optical Configuration
Purge Sealing
V/W
Purge tubes and purge barb included
Dimensions (W x D x H)
165 x 241 x 146 mm
Sample Holder Opening
Oval, 40 mm (W) x 22 mm (H)
Most, specify model and type
FTIR Compatibility
Gold Substrate Alignment Mirror (2” x 3”)
Specular Reflectance – Theory and Applications
At the reflective substrate, the beam reflects back to the
surface of the thin film. When the beam exits the thin film it has
geometrically passed through the film twice and is now represented
as IA. Infrared energy is absorbed at characteristic wavelengths as
this beam passes through the thin film and its spectrum is recorded.
The specular reflectance spectra produced from relatively thin
films on reflective substrates measured at near-normal angle of
incidence are typically of high quality and very similar to spectra
obtained from a transmission measurement. This result is expected
as the intensity of IA is high relative to the specular component (IR ).
Types of Specular Reflectance Experiments
• Reflection-absorption of relatively thin films on reflective
substrates measured at near-normal angle of incidence
• Specular reflectance measurements of relatively thick samples
measured at near-normal angle of incidence
S pecular R eflectance
Specular reflectance sampling in FTIR represents a very important
technique useful for the measurement of thin films on reflective
substrates, the analysis of bulk materials and the measurement of
mono-molecular layers on a substrate material. Often this technique
provides a means of sample analysis with no sample preparation –
keeping the sample intact for subsequent measurements.
The basics of the sampling technique involve measurement
of the reflected energy from a sample surface at a given angle of
incidence. The electromagnetic and physical phenomena which
occur at and near the surface are dependent upon the angle of
incidence of the illuminating beam, refractive index and thickness
of the sample and other sample and experimental conditions. A
discussion of all of the physical parameters and considerations
surrounding the specular reflectance sampling technique is
beyond the scope of this overview. We will present this technique
from an applications-oriented perspective.
• Grazing angle reflection-absorption of ultra-thin films or monolayers deposited on surfaces measured at a high angle of incidence
In the case of a relatively thin film on a reflective substrate, the
specular reflectance experiment may be thought of as similar to a
“double-pass transmission” measurement and can be represented as
shown in the following illustration.
Spectrum of thin film coating on a metal surface measured at 30 degrees
angle of incidence using the VeeMAX III specular reflectance accessory.
www.piketech.com
Beam path for reflection-absorption of a relatively thin film measured
by specular reflectance.
Pike Technologies
For relatively thick samples, the specular reflectance experiment
produces results which require additional considerations as the
specular component of the total reflected radiation is relatively high.
Again, the incident FTIR beam represented by I0 illuminates
the sample of a given refractive index (n2 ) and at an angle of
incidence (θ1 ). Some of the incident beam is reflected from the
sample surface, represented by IR at the incident angle (θ1 ). Some
of the incident beam is transmitted into the sample represented
by IT at an angle of θ2. As predicted by Fresnel equations, the
percent of reflected versus transmitted light increases with higher
angles of incidence of the illuminating beam. Furthermore, the
refractive index of the sample, surface roughness, and sample
absorption coefficient at a given wavelength all contribute to the
intensity of the reflected beam.
The incident FTIR beam represented by I0 illuminates the thin
film of a given refractive index (n2 ) and at an angle of incidence (θ1.).
Some of the incident beam is reflected from the sample surface,
represented by IR at the incident angle (θ1 ) and is also known as
the specular component. Some of the incident beam is transmitted
into the sample represented by IT at an angle of θ2 – calculated
from Snell’s Law.
Beam path for a relatively thick sample measured by specular reflectance.
608-274-2721
n1sinθ1 = n2sinθ2
58
Thin Films and More
At wavelengths where the sample exhibits a strong IR absorption,
the reflectivity of the sample increases. The superposition of the
extinction coefficient spectrum with the refractive index dispersion
results in a spectrum with derivative-shaped bands. This specular
reflection spectrum can be transformed using the Kramers-Kronig
conversion to a transmission-like spectrum as shown in the
example below.
Because of the orientation of the electromagnetic field at the
surface for grazing angle measurements, the use of an IR polarizer
greatly improves the sampling result. By collecting the spectrum at
grazing angle of incidence with p-polarization, we only examine the
enhanced portion of the electromagnetic field at the sample surface,
thereby producing a stronger absorbance spectrum.
Spectrum (upper – original) of a relatively thick polymer sample measured
at 30 degrees angle of incidence using the VeeMAX III; the lower spectrum
has been transformed using the Kramers-Kronig software algorithm and
is very similar to a transmission spectrum of the polymer polyethylene.
Grazing angle specular reflection analysis of a thiol mono-molecular layer
deposited on a gold-surfaced mirror using the PIKE VeeMAX III at 80 degrees
and p-polarization; the FTIR was equipped with an MCT detector.
Our third application of specular reflectance is the measurement of relatively thin films and mono-molecular layers at grazing
angle of incidence. At high angles of incidence, between 60 and
85 degrees, the electromagnetic field in the plane of the incident
and reflected radiation is greatly increased relative to a near-normal
angle of incidence. The perpendicular component of the electromagnetic field of the reflecting radiation is not enhanced.
Grazing angle specular reflection analysis produces a strong electromagnetic field oriented in the plane of the incident and reflected radiation.
59
Specular reflectance is a valuable FTIR sampling technique for
the analysis of thin films on reflective substrates, for relatively thick
films on reflective materials and for bulk materials where no sample
preparation is preferred. PIKE Technologies offers a complete line of
specular reflectance accessories to perform these analyses.
P olarization
Polarizers may be used to detect oriented samples and for
measurement of thin films on reflective substrates. PIKE
Technologies offers several crystal forms of polarizers and
automated versions for transmission, reflection and ATR sampling
covering the Vis, NIR, mid-IR and far-IR regions.
Manual Polarizers Page 60
7 different offerings for mid-IR, NIR and
far-IR spectroscopy
Automated Polarizers Page 60
Motorized polarizers for precision and
efficient measurements
Theory and
A pplications
Page 61
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Oriented Samples, Research Applications
Polarizers –
Manual and Automated Versions for Molecular Spectroscopy
There are two manual polarizer types available. The short form
has 5-degree scale resolution and the long form (Precision) offers
the more precise, 1-degree scale. Automated polarizers are also
available to address various sample compartment and accessory
configurations. The automated polarizers offer the added benefit of
increased setting reproducibility with accuracy to +/- 0.5 degree.
Specifications
Precision Automated
Polarizers, USB
Element Diameter
25 mm
Clear Aperture Diameter
20 mm
Dimensions (W x D x H)
Manual 50 x 86 x 9 mm (NIR glass manual
polarizers are 17-mm thick)
Precision Manual 50 x 142 x 9 mm
Automated Precision 50 x 146 x 55 mm
Manual
Polarizers
O r d e r i n g I n fo r m a t i o n
M anual P olarizers
Features
• Convenient, slide-mount design for all FTIR spectrometers
• Compatible with many PIKE Technologies accessories
• Available in manual and automated versions
• Elements for NIR, mid-IR, and far-IR applications
PIKE Technologies polarizers are used for a wide variety of
spectroscopy applications. Manual or automated versions are
available covering the NIR, mid-IR and far-IR regions. New to our
offerings is a NIR nanowire polarizer with ultra-high contrast. All
polarizers fit into a standard 2” x 3” slide mount and are compatible
with FTIR spectrometers. Polarizer elements are 25 mm in diameter
and, with mount, have a 20-mm clear aperture.
The polarizers are also compatible with many PIKE Technologies
accessories including the 80Spec, VeeMAX, and AGA specular
reflectance accessories. If you would like to add mounting to any of
our accessories, including ATR, please contact us.
PIKE automated polarizers provide specifications identical to our
manual versions, plus they are fully computer controlled, making
many previously labor-intensive applications feasible. With the
automated polarizer an
analysis program can
be set up through PIKE
AutoPRO software to
automatically collect all
spectra at user-specified
polarizer settings.
PIKE AutoPRO software
configured for the
automated polarizer.
61
Element TypeZnSe, KRS-5, Ge, CaF2, Glass
BaF2, Polyethylene
(select based upon spectral range and performance requirements)
Part Number Description
090-1000 Manual Polarizer, ZnSe
090-1200 Manual Polarizer, KRS-5
090-1500 Manual Polarizer, Ge
090-1400 Manual Polarizer, BaF2
090-1600 Manual Polarizer, Polyethylene
090-1300 Manual Polarizer, CaF2
190-2002
Manual Polarizer, Glass
090-3000 Precision Manual Polarizer, ZnSe
090-3200 Precision Manual Polarizer, KRS-5
090-3500 Precision Manual Polarizer, Ge
090-3400 Precision Manual Polarizer, BaF2
090-3600 Precision Manual Polarizer, Polyethylene
090-3300 Precision Manual Polarizer, CaF2
190-2000 Precision Manual Polarizer, Glass
Note: All manual polarizers are mounted into a 2” x 3” plate for use with the FTIR
spectrometer slide sample holder or the appropriate sampling accessory. Contact us
for a mount for your PIKE ATR accessory.
A utomated P olarizers
(select based upon spectral range and performance requirements)
Part Number Description
090-5000 Precision Automated Polarizer, ZnSe, USB
090-5100 Precision Automated Polarizer, KRS-5, USB
090-5400 Precision Automated Polarizer, Ge, USB
090-5300 Precision Automated Polarizer, BaF2, USB
090-5500 Precision Automated Polarizer, Polyethylene, USB
090-5200 Precision Automated Polarizer, CaF2, USB
190-2005
Precision Automated Polarizer, Glass, USB
Notes: All automated polarizers are mounted into a 2” x 3” plate for use with the
FTIR spectrometer slide sample holder or the appropriate sampling accessory.
The automated polarizers include the PIKE Technologies Motion Control Unit
and AutoPRO software for fully automated operation. Contact us for short form
automated polarizers.
Infrared Polarizers – Theory and Applications
K1 = Transmission efficiency for normally incident polarized
light whose electric field vector is perpendicular to the wire
direction.
K2 = Transmission efficiency for normally incident polarized
light whose electric field vector is parallel to the wire
direction.
For a ‘perfect polarizer’ K1 = 1, which means full transmission
of polarized light whose electric field vector is in the preferred
direction and K2 = 0, which means complete blockage of a beam of
polarized light whose electric vector is perpendicular to the former.
Other measures of performance deduced from K1 and K2 are
Degree of polarization =
Extinction Ratio =
( K1 − K 2 )
( K1 + K 2 )
1
2K 2
Polarization efficiency depends on smaller grid spacing than
the wavelength and on the conductivity of the wires. In the case
of a ruled polarizer, the surface of the optical element is created
by a diamond needle to form very fine parallel lines, such as 1200
lines/mm, on the surface. The optical element is then placed
into a vacuum chamber and this pattern is partially coated with
aluminum or other evaporated metallic layer. The spacing between
the evaporated thin lines has to be very small, typically a fraction
of the wavelength. Ruled polarizers have good performance and are
durable at high laser powers, but can only be made on hard, nongranular materials that can be ruled, such as ZnSe.
Holography is another method used to form the fine metallic
wire pattern on the surface of the polarizer element. Two
coherent laser beams are directed onto the surface of the optical
element which is coated with a very thin layer of photo resist. The
interference pattern formed at the intersection of the two beams is
allowed to expose the photo resist. The lines in between the exposed
photo resist are removed and then coated in a vacuum chamber
similar to the ruled grating type. The advantage of holographic
polarizers is that a wider variety of materials can be used such as
the softer KRS-5. As mentioned earlier, the efficiency of the polarizer
depends on the grid spacing formed among the wires. Holographic
techniques allow more uniform grid patterns because the spacing
is produced optically. Light scatter due to imperfections of ruled
grooves are also reduced. If the grid spacing is smaller, the polarizer
is more efficient. The spacing errors have also much less effect on
the efficiency if the grid is much smaller than the wavelength. The
trade-off with tighter grid is the reduction of the optical throughput.
These parameters are carefully optimized in the design of the
polarizer elements and the right polarizer can be selected for
specific experimental conditions.
Specifications and performance characteristics of polarizers
offered by PIKE Technologies are shown in Table 1.
Principal transmittance ratio or contrast =
Un-polarized
Light
P Polarization
Transmitted
Horizontal Lines
- Line Width
- Period
Substrate
Graphical representation of the polarization effect.
Table 1: Polarizer properties.
Polarizer Type
Application
Cutoff, cm-1 Transmission Spectral Range Efficiency, K1
Undesired Degree of Polarization,
Transmission, K2(K1-K2)/(K1+K2)
ZnSe Mid-IR, General Purpose460
KRS-5 Mid-IR, Wide-range 200 75%0.25% 99%
Ge Mid-IR, Highest Efficiency5500–570
Polyethylene Far-IR, Widest Range500–10 80%
CaF2 NIR Applications
Vis/NIR Broadband
BaF2
Mid-IR
90%
1%
0.25%
4%
97%
99%
93%
80085%1% 98%
20,000–3030
85%
0.05%
99%
840 70%0.1% 99%
608-274-2721
Glass
70%
www.piketech.com
Polarizers may be made from very fine conducting parallel
elements or grid placed upon a suitable transparent base material.
When the grid spacing is much smaller than the wavelength of
light, the light with the electric vector parallel with the grid will be
reflected and only the component with perpendicular electric vector
will be transmitted (shown graphically on the right).
The overall transmission characteristic of the polarizer depends
upon the substrate, but the polarization efficiency depends upon the
period, line width and other design parameters of the polarizer.
In the mid-infrared range, the most practical and commonly
used polarizers are ruled or holographic wire grid structures. The
polarization effect comes from the same principle as the free
standing wire grid, except the fine wires are formed on the surface
of an infrared transmitting optical window material.
Pike Technologies
S Polarization
Reflected
P olarization
Polarizers are valuable tools used for spectroscopic analysis of
sample orientation and for measuring thin films on reflective
surfaces. This overview presents basic polarization theory and
highlights some useful polarization applications.
For the purposes of discussing polarizers, light is considered an
electric field with a magnitude oscillating in time. Light propagating
along the z axis can be described as a combination of electric
vectors in x and y axis. Linearly polarized light may be thought
of as consisting of an x and a y component with different relative
magnitudes. For example, if the y component is close to zero, the
light is considered fully polarized in the x direction.
Polarizers are devices that split unpolarized light into two
orthogonal components; one of the linearly polarized components
is transmitted, the other is reflected, redirected or absorbed. The
most important features of a good polarizer are brightness, contrast
and durability. Brightness and contrast can be described by two
main parameters; K1 and K2.
Notes: Efficiency values reported at 1000 cm-1 for mid-IR, at 3300 cm-1 for NIR, at 5000 cm-1 for glass Vis/NIR and 100 cm-1 for far-IR. All polarizers are holographic, wire grid for
maximum performance.
62
Oriented Samples, Research Applications
The optical material substrate used to create the polarizers
determines the wavelength range of the polarizer – such as ZnSe or
KRS-5. Table 1 shows the K1 values of PIKE Technologies polarizers. The
maximum transmitted light is affected by the transmission of the
materials and the scattering of the ruled and evaporated
surfaces. Fresnel losses are determined by the refractive index and
the performance of the anti-reflection coating on the element. The
maximum transmission compared to a fully depolarized open beam
is typically less than 50%. However, FTIR spectrometers
produce slightly polarized beams, which in most cases are oriented in
the vertical direction in the sample compartment. Thus the apparent
transmission of a single polarizer oriented vertically
and compared to open beam can be over 50%.
The other critical parameter of polarizers, the contrast,
can be measured by crossing two polarizers and recording the
throughput signal. For efficient polarizers in a practical spectroscopy
setting, such as using a converging infrared beam in the sample
compartment of an FTIR spectrometer, it is expected that the
light level should be less than 1%. For selected high performance
polarizers it can be better than 0.5%.
Polarizers are usually mounted in a plastic disc and placed
in a rotating holder with an angle scale. This way, the angle of the
polarizer orientation can be positioned with approximately
1 degree repeatability. Motorized polarizers are available with much
better angular accuracy and precision. The automated polarizers are
also very useful for conducting a series of experiments with different
angle settings under complete computer control.
One of the main uses of infrared polarizers is to monitor
molecular orientation in samples such as films and fibers. During
manufacture polymers tend to orient along the axis of the
mechanical stretching and this preferred orientation is retained after
the material stops flowing. In some cases, polymers are a mixture of
crystalline, more polarized, and amorphous, less polarized, forms of
the material. In order to study orientation, polarized light is directed
on the film or fiber. The polarized light electrical vector coinciding
with the dipole of the infrared active moiety increases in absorption
intensity, thereby revealing the band assignment and the orientation
of the molecular group. Single crystals placed in the focus of
polarized light also absorb selectively, depending on the orientation
of the crystal.
Polarizers can also be used in conjunction with attenuated total
reflection (ATR). Even without polarizers, for any ATR that retains
the orientation relative to the incoming infrared beam, there could
be spectral differences noted when an oriented sample is placed
with its direction along the optical axis or perpendicular to it. The
phenomenon is related to penetration depth differences for the light
components polarized parallel or perpendicular with the reflective
surface (see ATR Theory and Applications).
Another important application of polarizers is the enhancement
of the signal measuring thin films on polished semiconductors,
metallic mirrors and other reflective surfaces.
Using large angle reflectance optics, the grazing angle
reflectance of the thin films can be measured. Substantial signal
enhancement can be achieved by using polarized light in
conjunction with a grazing angle accessory. As an example, a
thin oily deposit on a gold mirror can be measured with good
signal-to-noise ratio by using polarized light with a specular
reflectance accessory set at 80 degrees. Background spectra for
each result were collected at the identical polarization angle as the
sample. As seen in the spectra below, the light polarized such that
the electric vector is perpendicular to the metallic mirror
surface is enhanced. The spectrum measured with the polarization
perpendicular to the surface (electric vector parallel with the
surface) is not detected. The non-polarized light measurement is a
combination of the two polarized measurements, showing a
signal with less contrast than the red trace.
FTIR spectra with vertical and horizontal polarization.
Summary
Polarizers are highly useful spectroscopy sampling tools for
the measurement of samples with molecular orientation, for
measuring thin films on reflective surfaces and for molecular
spectroscopic research.
Spectra for high density polyethylene (HDPE) with parallel and
perpendicular polarization demonstrate that this sample is oriented.
63
Integrating Spheres
Integrating spheres are useful for qualitative and quantitative
measurements of sample composition when morphology,
particle size, surface roughness or sample flatness varies from
sample to sample. PIKE Technologies offers fully integrated
accessories for mid-IR and NIR applications.
Mid-IR IntegratIR™ Page 64
Integrating Sphere Accessory
Advanced measurements in the mid-IR spectral region
External IntegratIR™ Page 66
Integrating Sphere Accessory
For large-sized samples
NIR IntegratIR™ Page 67
Fixed 10 Degree Angle of Incidence
Near-normal sample reflectivity measurement
Theory and
A pplications
Page 69
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Reflectance From All Perspectives
Mid-IR IntegratIR – Integrating Sphere
Both upward- and downward-looking mid-IR spheres feature
a 12-degree illumination of the sample, and offers a specular
exclusion port. For the upward-looking sphere, reflectance
samples are placed directly onto the sample port located on
the top of the sphere. This sphere is ideal for large and/or thick
solid samples. For powder samples, a standard ZnSe window is
available. If preferred, a KBr window can also be used with the
sample plate to minimize the reflection loss compared to the ZnSe.
Features
• 3-inch sphere – gold-coated, Lambertian scatterer for
high-performance measurements
• 12-degree hemispherical diffuse reflectance measurement
with specular exclusion port
• Diffuse transmission station for measurement of highly
scattering samples in transmission mode
• Choice of integrated, high-performance detector MCT or
DTGS for ultimate configurability
• Upward- and downward-looking optical configurations to
accommodate a wide range of sample sizes and types
• In-sample-compartment design to minimize laboratory
space requirements
• Configurations available for most FTIR spectrometers
The integrating sphere is very often an accessory of choice when
studying reflectance properties of solids, analyzing light-scattering
and/or highly absorbing samples and collecting spectra difficult to
obtain with standard sampling techniques. PIKE Technologies offers
mid-IR integrating spheres, designed for research and standard
applications that require sensitivity and the ability to collect highquality data from difficult to analyze samples.
The PIKE IntegratIR™ spheres are available in upward- and
downward-looking configurations and are suitable for the measurements of absolute and relative diffuse reflectance of solids,
powders and opaque liquids. Each feature a 3-inch diameter highly
reflective gold-coated sphere. The accessory mounts in the sample
compartment of the FTIR spectrophotometer, and uses a dedicated
detector for maximum performance.
Optical diagram of the upward-looking IntegratIR Sphere
The downward-looking Mid-IR IntegratIR allows the sample to
be placed underneath the sphere. This configuration is desirable for
measurements of powders and particulate materials because the
incidence beam strikes the sample directly, without passing through
an IR transparent window.
For all spheres, the selection of light illumination onto the
sample or onto the reference surface is done via a flipper mirror.
This allows the background to be collected using either the
substitution method or the Taylor method.
Diffuse transmittance of partially transmitting materials can be
measured with either sphere. This is done by placing the sample on
a standard 2 x 3” sample holder and sliding it in the mount located
in front of the transmission port.
Downward-looking
IntegratIR
Gold-coated Lambertian finish sphere
64
Specifications
Optical DesignUpward- or downward-looking
sample spheres
Angle of Incidence
12 degrees
Sphere Size and Surface3” (76.2 mm) gold-coated
Lambertian surface
Sample Port Size
Specular Exclusion Port Sphere Dimensions
(W x D x H)
Sample Opening, Downward Sphere
(W x D x H)
Detector Choice
Spectral Range, Wide-band: 5000–500 cm-1
MCT DetectorsMid-band: 5000–650 cm-1
Narrow-band: 5000–800 cm-1
20 mm
Standard
159 x 248 x 154 mm (excludes baseplate)
50.8 x 35.5 x 12.7 mm
DTGS, MCT or InGaAs
Spectral Range, Extended DTGS Detector
with CsI Window
5000–250 cm-1
12,200–3850 cm-1
Spectral Range, InGaAs Detector
I ntegrating S pheres
A selection of mercury cadmium telluride (MCT) or deuterated
triglycine sulfate (DTGS) detectors is offered with the IntegratIR
spheres. This allows the accessory to be optimized for the application
and sample type. The wide-band MCT is the commonly configured
detector while the less sensitive DTGS is an option for users who
require the convenience of a room temperature detector. The MCT
detector is approximately 50 times more sensitive compared to the
DTGS detector. The accessory comes with built-in detector electronics
and interfaces with most FTIR spectrometers. All detectors are
pinned in place and interchangeable. For those with both mid- and
near-IR spectral capabilities on the FTIR spectrometer an InGaAs
detector may be purchased for sensitive NIR diffuse reflectance or
transmittance measurements.
O r d e r i n g I n fo r m a t i o n
Part Number Description
Absolute reflectance spectrum of a painted black panel measured using
the PIKE Mid-IR IntegratIR.
Mid-Infrared IntegratIR Integrating Sphere Accessory
12 Degree Upward Sample Positioning
Includes sphere, purge enclosure and tubing, diffuse
gold reference and sample plate with ZnSe window
048-11XX
Mid-Infrared IntegratIR Integrating Sphere Accessory
12 Degree Downward Sample Positioning
Includes sphere, purge enclosure and tubing,
one diffuse gold reference and powder sample cup
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Your FTIR spectrometer must be capable of interfacing with an external detector.
D etector C hoice for I ntegrat IR (must select one)
Part Number Description
Wide-band MCT Detector
048-3250 Mid-band MCT Detector
048-3150 Narrow-band MCT Detector
048-3450 DTGS Detector with CsI Detector Window
048-3550
InGaAs Detector
Notes: Detector includes preamplifier electronics. MCT detectors require liquid
nitrogen for cooling.
Comparison of transmission spectrum of paper collected using an
integrating sphere or in transmission mode without a sphere.
R eplacement P arts and S ampling O ptions
Part Number Description
048-0108
Sample Plate with 20 x 2 mm ZnSe Window
for Upward IntegratIR
048-3000
Diffuse Gold Reference for Upward IntegratIR
048-3001
Diffuse Gold Reference for Downward IntegratIR
048-2020
Powder Sample Cup for Downward IntegratIR
048-2050
Sample Slide for Downward IntegratIR
608-274-2721
048-0208Sample Plate with 20 x 2 mm KBr Window
for Upward IntegratIR
www.piketech.com
048-3350 Pike Technologies
048-12XX
65
Reflectance From All Perspectives
External Integrating Sphere – Precise Reflectivity Measurements
The internal optics of the External Integrating Sphere focus
light from the external beam of the spectrometer into a 4 inch goldplated integrating sphere. A translation mirror is moved manually
through a flipper lever located on the external enclosure of the
accessory for precise movement between the sample and reference
positions. In the sample position, incident light is 8° from normal.
Specular reflection may be excluded by opening a port at the top of
the sphere. Both the sample and specular ports are baffled from the
detector port. The detector port is 90° from the sample port.
Reference Position
Sample Position
Features
• Accommodates large-sized sample
• 4 inch sphere – gold-coated, Lambertian scatterer for high
performance measurements
• 8 degree hemispherical diffuse reflectance measurement with
specular exclusion port
• Manual external translation mirror to switch between the
Optical diagram of the FT-IR external beam path for reference and
sample positions.
reference and sample position
• Integrated, high-performance MCT detector
• Utilizes external spectrometer beam to allow for the analysis of oversized samples positioned under the sphere
• Fully purgeable enclosure
An integrating sphere is very often an accessory of choice when
studying reflectance properties of solids, analyzing light scattering of
highly absorbing samples and collecting spectra difficult to obtain
with standard sampling techniques. The External Integrating Sphere
Accessory, which utilizes the external beam of the spectrometer, is
ideal for large samples due to the additional sampling space realized
by positioning sample underneath the sphere for precise reflectivity
measurements.
Accurate measurement of both solid- and liquid-phase samples
is possible with the 4” External Integrating Sphere. In particular, the
accessory attaches to the side of the spectrometer, to accommodate
measurement of very wide samples. By utilizing highly-accurate
Taylor methodology for measurement, high-quality components, and
sensitive MCT detection, the 4” External Integrating Sphere offers lownoise, highly accurate measurements for a wide range of samples.
O r d e r i n g I n fo r m a t i o n
Part Number Description
048-13XXL
Mid-Infrared External Integrating Sphere Accessory — Left
Includes sphere, purge enclosure and tubing.
048-13XXR
Mid-Infrared External Integrating Sphere Accessory — Right
Includes sphere, purge enclosure and tubing.
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Accessory uses the spectrometer’s external beam. Spectrometer must be equipped to
accept an external detector.
D etector (must select one)
Part Number Description
048-3360
Wide-Band MCT Detector for External Sphere
048-3260
Mid-Band MCT Detector for External Sphere
048-3160
Narrow-Band MCT Detector for External Sphere
O ptions
Part Number Description
048-3000
66
Low reflectivity measurement using the External Integrating Sphere
Accessory.
Diffuse Gold Reference
NIR IntegratIR – Integrating Sphere
• Optimized 2” gold-coated integrating sphere with high
signal-to-noise ratio
• Fully integrated InGaAs detector, detector electronics and
I ntegrating S pheres
Features
The PIKE Technologies NIR IntegratIR™ is a near-infrared (NIR)
integrating sphere for quantitative and qualitative measurements
of a wide variety of solids and paste materials. The NIR IntegratIR
collects reflected energy from a spherical perspective thereby
capturing complete and quantitative response from the sample.
Using near-infrared chemometrics, qualitative product identification
and quantitative analysis may be performed on pharmaceutical,
nutraceutical, chemical, polymer, textile, food, agricultural and
other samples.
The NIR IntegratIR accessory features a 2” high reflectivity
gold-coated integrating sphere and an extended range, high-speed,
low-noise indium gallium arsenide (InGaAs) detector, transfer optics
and interface electronics. The NIR IntegratIR fits into the sample
compartment of most commercial FTIR spectrometers and its
electronics interface as an external detector of the spectrometer. A
10-mm diameter horizontal sampling port makes the placement of
samples onto the accessory easy. An optimized borosilicate window
serves as a sampling port at the top of the integrating sphere. The
window is bonded and sealed to protect the sphere from corrosive
materials and contamination.
Sampling of tablets, packaging materials and plastics is easily
accomplished by placing the sample directly on the window of
the upward-looking sphere. Powders, creams, pastes or liquids
containing reflective particles may be placed in disposable flatbottom vials – eliminating the need for any sample cleanup. The
vials may be held in place by a sample-positioning vial holder,
resulting in more repeatable measurements.
High-quality spectra are produced quickly using the NIR
IntegratIR – making qualitative and quantitative analysis of a
wide variety of sample types efficient and reliable.
transfer optics
• Optional automated transmission analysis stage for
pharmaceutical analysis
Pike Technologies
• 10-mm horizontal sampling port for easy sample placement
• Excellent qualitative and quantitative NIR analysis tool
• Economical alternative to dedicated near-infrared analyzers
• Optional rotating stage for averaging of heterogeneous
samples
• Spectral range 12,200–3850 cm-1
• In-sample-compartment design, compatible with most
commercial FTIR spectrometers
For heterogeneous samples, PIKE Technologies offers a rotating
stage for the NIR IntegratIR. With this option, one obtains an
averaged result to eliminate variations in quantitative results for
the chosen sample area.
Optical diagram of the NIR IntegratIR.
608-274-2721
Rotating stage for
petri dish
www.piketech.com
Qualitative analysis of steroids using the PIKE Technologies NIR
IntegratIR. Samples are measured within glass vials.
Rotating stage
for beaker
67
Reflectance From All Perspectives
O r d e r i n g I n fo r m a t i o n
Part Number Description
048-60XX
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Your spectrometer must be capable of interfacing with an external detector.
S ampling O ptions
Part Number Description
Quantitative measurement of active ingredient in a mixture of magnesium
stearate, lactose, EMCOMPRESS®, cellulose and CAB-O-SIL­­®
The NIR IntegratIR comes complete with diffuse gold reference,
sample holders and a removable general-purpose sample mounting
plate. It is configured for each specific FTIR spectrometer and
includes a pre-aligned mount for your instrument.
The NIR IntegratIR is a cost-effective, high-performance
sampling option for laboratories with a standard FTIR spectrometer
equipped with a near-infrared light source and beam splitter.
The optional transmission tablet analysis stage (below) for the
NIR IntegratIR provides an automated tool for sampling 10 tablets
of varying sizes. With this option you can measure formulation
reproducibility or verify pharmaceutical composition.
NIR IntegratIR with optional transmission tablet analyzer
68
NIR IntegratIR Integrating Sphere Accessory
Includes 2” diffuse gold-coated integrating sphere, InGaAs
detector, detector preamplifier, diffuse gold reference,
vial holder, and 25 glass vials.
048-3000
Diffuse Gold Reference
048-3070
NIST Traceable NIR Reference Standard
048-3071
NIST Traceable NIR Reference Standard – Recertification
044-3010
Glass Vial Holder for 19-mm vials
048-2999
Glass Sample Vials, 19 x 65 mm (25 ea.)
048-0150 Rotating Stage for petri dish for heterogeneous samples
Includes 100 x 20 mm Petri Dish
048-0151
Rotating Stage Adapter for 500 mL beaker
048-0060
Automated Transmission Tablet Analysis Stage
for NIR IntegratIR
Includes 3 tablet plates for 7.5, 8.5 and 10-mm tablets
Note: Please contact us for other options. Stage rotates counterclockwise.
Integrating Spheres – Introduction and Theory
Integrating Sphere Optics
Reflectance sampling accessories rely upon a light beam coming
from the spectrometer to be focused upon the sample. In order
to achieve the best signal-to-noise ratio (SNR), the smaller the
focus is, the easier it is to refocus the illuminated sample spot
back onto the detector. In order to measure light reflected at a larger
angle, optical designs will allow only a small area of the sample to
be projected onto the detector. This arrangement
serves well if the sample is microscopically homogeneous, but
will result in a larger sample position error. When the sample is
moved, the focused beam will see a different portion of the sample
resulting in measurement-to-measurement differences. This is
called insertion error because the spectrum will be slightly
different each time the sample is inserted.
Some industrial or natural samples are inhomogeneous
either because they are mixtures of different substances or
because they have a particle size comparable to the probing
beam diameter. Clearly, if the probing beam could be larger and
the reflected light could all be collected, a more representative
spectrum could be measured.
Some other samples develop a directional scattering. For
example, fibers wound on a mandrel are highly oriented, not just
macroscopically as parallel, unidirectional filaments, but also in
many cases the molecules of the drawn fibers are oriented within
the fiber itself. Such a sample, when placed in a reflectance
accessory will generate different results depending on the angle
from which the detector is “viewing” the sample. When the overall
reflectance needs to be measured reproducibly, for example to
measure the concentration of a minor ingredient in the sample,
only isotropic optical systems, insensitive to such directionalities
could be utilized.
Furthermore, in some cases, not just the reflectance in a
small solid angle but the reflectance in all angles is sought. Most
reflectance accessories measure at fixed or variable angles, narrower or wider collection angles, but there is a need for a device
that uniformly collects all reflected light from a sample. In other
words it measures the total reflectance of the sample.
Therefore the main reasons for using integrating spheres for
the measurement of sample reflectance are the following:
Integrating spheres are highly reflective enclosures that are
placed in close proximity to the sample, such that the reflected
light enters the sphere, bounces around the highly reflective
diffuse surface of the sphere wall and finally impinges upon the
detector – usually part of the integrating sphere assembly. The
name, integrating sphere, refers to one of the main functions of
the device, namely that it spatially integrates the light flux, in our
application the light reflected from a sample. In spite of the long
history of engineering and development of the sphere, the applications and further developments continue to this day. Advances
in the theory, detector and electronics development and most of
all, new applications, drive the progress.
As the name implies, the main part of the device is a sphere
with a very highly reflecting inner surface. The surface should
approach the ideal Lambertian scatterer, which means that the
light falling on the surface is evenly scattered in all directions and
the scattered light intensity is proportional to the cosine of the
angle of observation.
• Uniform detection of reflectance even when the sample is
inhomogeneous
• Isotropic detection of reflectance even on samples that reflect
in preferred directions
• Measurement of absolute reflectance (with special
integrating spheres)
All of the above concerns are addressed with integrating sphere
based reflectometers.
Baffle
ρw
Entrance
Port (Ae)
F.O.V.
Detector
Port (Ad)
Area of
Surface (As)
Optical geometry of an integrating sphere.
In an upward-sample-positioning sphere the infrared beam
from the interferometer is directed through an entrance port
onto the sample placed behind the sample port (shown above).
Samples can be directly touching the sphere or separated from
the sphere by a thin, infrared transparent window. The detector
is placed close to the sphere, so that it can view the integrating
sphere with a large solid angle. In order to improve the isotropy
(non-directionality) of the detection, the detector is not directly in
the line of sight of the sample. A small, also highly reflective and
scattering baffle is placed in the sphere such that it blocks the
first reflection of the sample from reaching the detector.
www.piketech.com
• Reduction of polarization effects from the illuminating beam
and the sample
Sample
Port (As)
Pike Technologies
• Efficient measurement of combined diffuse and specular
reflectance
Sample
I ntegrating S pheres
Measuring Sample Reflectance
608-274-2721
69
Reflectance From All Perspectives
A well-designed sphere has the sample close to the sphere
geometry so that the sphere will collect close to the full available
hemispherical reflectance (2π steradians). A window to separate
the sphere and sample may be important in some cases, but it
will place the sample a small distance from the sphere, thereby
somewhat reducing the collected high-angle reflectance. The PIKE
Technologies integrating spheres are coated with the highest
possible reflective surface for the desired wavelength region. The
coating of the surface of the sphere has to be uniform and close
to being a perfect Lambertian scatterer. These characteristics
allow the light falling in the sphere to be uniformly distributed
over the entire surface of the sphere. It is also important how
much of this light is actually collected on the detector surface.
where Φi is the input light flux.
For the sphere the area of the sphere obviously depends on
the sphere diameter, and thus the formula shows that a smaller
sphere is brighter than one with a larger diameter.
Sphere Throughput
The throughput of a single sphere may be defined as a function
of the hemispherical reflectance to the average spherical wall
reflectance ratio. The closer the sphere surface is to ideal
reflectance, the higher the throughput. The detector, the sample
and the illumination require that a portion of the wall of the
complete sphere be removed. Smaller cutouts for beam input
and output result in higher energy throughput. Due to other
considerations, such as reduction of light scatter from the edges
of the sphere cutouts, called ports, these have to be optimized
and cannot be too small.
The throughput can be expressed with these sphere design
parameters:
The sphere diameter cannot be reduced too far however,
because the sample diameter will also have to be decreased
proportionally when the sphere is smaller. For typical spectroscopic
applications the optimum sphere diameter is influenced by the
beam size coming from the FTIR spectrometer and the typical
sample size of 3–25 mm. Most integrating sphere modules use a
2–4 inch diameter sphere to accommodate the above design
parameters. In a practical design, the openings of the sphere need
to be kept around 5% for optimum throughput. Wall reflectance
is usually between 95–99% and results in a sphere gain of 10–30.
Integrating Spheres for Mid-IR and NIR
Where Ad is the detector area, As is the sphere area, ρw is the
sphere wall hemispherical reflectance, ρw, avg is the average sphere
wall reflectance.
The sphere throughput is higher if the light falling on the
detector is increased by the multiple reflections of the light.
Another way of looking at the integrating sphere is that it enhances
the detector signal by collecting the light, and if the wall surface
is reflective enough, bounce it around until it illuminates the
detector. The factor that is used to express this gain is called the
sphere multiplier (M), which is a function of the wall reflectance
(ρw), the proportion of the total area of ports to the surface of the
sphere (f).
70
The brightness of the sphere (Ls ), using the same amount of
input light flux, is dependent on the wall reflectivity, the port-tosphere surface ratio and the size of the sphere surface.
Integrating spheres, although much more efficient than an optical
system with an equivalent detector position, still have lower
throughput than the direct imaging optics. In the visible and NIR
spectral region, where there are very good sources and excellent,
high-speed detectors are readily available, the SNR is usually not
limited by the reduced light level. In the mid-IR spectral region,
in order to utilize the above discussed advantages and benefits of
integrating spheres, the reduced throughput needs to be offset by
the use of the high sensitivity, cooled detectors, such as the liquid
nitrogen cooled MCT detector utilized by PIKE Technologies. The
near-infrared and mid-infrared measurements using integrating
sphere optics have different analytical and measurement goals as
well as different features. PIKE Technologies offers both mid-IR
and NIR versions.
Remote Sampling
Accessories
Hollow waveguide and fiber optic sampling accessories provide a
new dimension of flexibility – expanding the reach of the sample
compartment. The probe is flexible and may be taken to the
sample; such as an unwieldy object too large to be placed on an
accessory or in a chemical reaction vessel. PIKE offers NIR and midIR versions of remote sampling probes.
Mid-IR FlexIR™ Page 72
Mid-IR Hollow Waveguide Accessory
Remote and flexible sampling in the mid-IR spectral region
NIR FlexIR Page 75
NIR Fiber Optic Accessory
Remote sampling in the NIR spectral region
Introduction
and A pplications
Page 76
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Extending Your Sample Compartment
Mid-IR FlexIR –
Hollow Waveguide Accessory for Remote Infrared Sampling
The FlexIR is designed for ruggedness and wide spectral range.
It utilizes a customized optical design with diamond-turned focus
optics providing exceptional IR throughput. The hollow waveguides
are very durable and free from the typical fracture problems
encountered with polycrystalline core fibers. The highly-reflective
hollow waveguides transmit maximum energy through the full
mid-IR spectral region – eliminating the need for multiple fibers
for complete spectrum coverage when chalcogenide or halide
probes are used.
Features
• Fast, easy identification of solids and liquid samples
outside of the sample compartment
• 1 or 2 meter, hollow waveguides offer exceptional
durability and high throughput
• Full mid-IR spectral range coverage
• ATR, specular and diffuse reflectance probes for a
complete array of sampling applications
• Standard and high-temperature/high-pressure probes for
reaction monitoring
• Permanent alignment of sampling probe to the hollow
waveguide for consistent analysis results
• MCT or DTGS detector choice for maximum sensitivity
and convenience
• Compatible with most FTIR spectrometers
Visible defect on manufactured product – Mid-IR FlexIR accessory with
ATR probe.
For maximum configurability two FlexIR bases, with an MCT
or DTGS detector, are available. Two detector options serve to
optimize the signal-to-noise ratio (SNR) against the required spectral
range and the application needs. The mid-band MCT style is the
most versatile and common detector offered because of its high
sensitivity and fast data collection. A DTGS FlexIR base is available
for those applications that do not require a high SNR, and benefit
from the flexibility and convenience of a room temperature detector.
To optimize its performance, the DTGS detector is integrated into
the probe. This probe is equipped with a short handle for ease of
positioning and sampling.
The PIKE FlexIR™ Mid-IR Hollow Waveguide Accessory is an excellent
tool for remote and specific area analysis of a wide variety of
samples. Visible surface contamination, small area material
identification and bulky materials too large to fit into the FTIR
sample compartment are a few of the many samples and application
types for the FlexIR accessory.
FlexIR with DTGS
72
Specifications
Optical Design
All reflective, diamond-turned
focus optics
Accessory Dimensions, MCT Model (W x D x H)
153 x 132 x 150 mm
(excludes FTIR baseplate and mount)
Accessory Dimensions, DTGS Model (W x D x H)
60 x 67 x 80 mm
(excludes FTIR baseplate and mount)
Specifications
High-Temperature/High
Pressure Diamond ATR
Probe
Spectral Range ATR
ZnSe
Ge
Diamond
Mid MCT
5000–700 cm-1
5000–700 cm-1
5000–700 cm-1
DTGS
5000–550 cm-1
5000–700 cm-1
5000–550 cm-1
Spectral Range Specular
5000–700 cm-1
5000–550 cm-1
R emote S ampling
For reaction monitoring, the accessory can be equipped with
a high-temperature/high-pressure probe. The probe is made of
Hastelloy and features a two-reflection ATR diamond crystal. The
6.35-mm shaft diameter and 178-mm length make it suitable for
use in a wide variety of reaction vessels. The probe maximum
temperature is 150 °C, with maximum pressure up to 8.3 MPa.
Specifications
Probe Design
Hollow waveguide, full mid-IR reflective
Bend Radius, Minimum
150 mm
HWG Dimensions
1 or 2 m long, 1.6 mm OD, 1.0 mm ID
Diamond ATR Probe
Probe Body
Hastelloy C-276
ATR Crystal Monolithic Diamond
ATR Crystal Diameter
Number of Reflections
Maximum Temperature
4.5 mm
2
150 °C (High-Temperature/High-Pressure)
80 °C (Basic)
Maximum Pressure
8.3 MPa (1204 psi)
Shaft Dimensions
Standard ATR Probes
- MCT Version
178 mm length, 6.35 mm diameter
Probe BodyHandle: Aluminum
Sampling Tip: Stainless Steel
Maximum Sample Depth
60 mm
ATR Crystal Types
Diamond/ZnSe, ZnSe, and Ge
ATR Crystal Diameter Maximum Operating Diamond/ZnSe: Ambient
Temperatures - ZnSe: 60 °C
MCT Version
Germanium: 60 °C
Maximum Operating Diamond/ZnSe: Ambient
Temperatures - ZnSe: Ambient
DTGS Version
Germanium: Ambient
Pike Technologies
4.5 mm
Gold-coated, 20 degree AOI
Diffuse Reflectance Probe
Gold-coated, 2.5 mm port
Shaft Dimensions of all 102 mm length, 22 or 12 mm diameter
Standard Probes, MCT
www.piketech.com
Specular Reflectance Probe
608-274-2721
73
Extending Your Sample Compartment
O r d e r i n g I n fo r m a t i o n
M id -IR F lex IR B ase with MCT D etector
M id -IR F lex IR B ase with DTGS D etector
Part Number Description
Part Number Description
045-30XX
045-35XX
Mid-IR FlexIR Base for MCT Version
Mid-IR FlexIR Base for DTGS Version
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
The FlexIR is provided with base optics mounting for the sample compartment of your
FTIR spectrometer. An on-board MCT detector must be selected (below). Your FTIR
spectrometer must be capable of interfacing with an external detector.
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
The FlexIR is provided with base optics mounting for the sample compartment of your
FTIR spectrometer. Your FTIR spectrometer must be capable of interfacing with an
external detector. The DTGS detector is integrated into the probe.
H ollow W aveguide MCT D etectors
P robes for M id -IR F lex IR with DTGS D etector
(must select one)
(must select one or more)
Part Number Description
Part Number Description
045-3200
Mid-band MCT Detector
045-5100
Diamond/ZnSe ATR Probe, 1 m
045-3100
Narrow-band MCT Detector
045-5010
ZnSe ATR Probe, 1 m
045-5050
Ge ATR Probe, 1 m
045-5030
Specular Reflectance Probe, 1 m
P robes for M id -IR F lex IR with MCT D etector
(select one or more)
Part Number Description
Notes: Sampling probes are fixed to the hollow waveguides for maximum sampling
reproducibility. DTGS detector is integrated into the probe. Specular probe
­­­is open-tipped and is not suitable for powder or liquid sampling.
045-4200
Diamond ATR Probe, basic, 1 m
045-4300
Diamond ATR Probe, High-Temperature/High-Pressure, 1 m
H ollow W aveguide P robe H olders
045-4100
Diamond/ZnSe ATR Probe, 1 m length, 22 mm diameter
Part Number Description
045-4102
Diamond/ZnSe ATR Probe, 2 m length, 22 mm diameter
045-3400 Adjustable Probe Holder
045-4010
ZnSe ATR Probe, 1 m length, 22 mm diameter
045-3410 Standard Probe Holder
045-4012
ZnSe ATR Probe, 2 m length, 22 mm diameter
Note: Probe holders may be used with all standard hollow waveguide probes.
045-4050
Ge ATR Probe, 1 m length, 22 mm diameter
045-4052
Ge ATR Probe, 2 m length, 22 mm diameter
045-4030
Specular Reflectance Probe, 1 m length, 22 mm diameter
045-4032
Specular Reflectance Probe, 2 m length, 22 mm diameter
045-4020
Diffuse Reflectance Probe, 1 m length, 22 mm diameter
045-6000
Diamond/ZnSe Probe, 1 m length, 12 mm diameter
045-6100
ZnSe Probe, 1 m length, 12 mm diameter
045-6200
Ge Probe, 1 m length, 12 mm diameter
Standard
Probe Holder
Notes: Sampling probes are fixed to the hollow waveguides for maximum sampling
reproducibility. Diffuse and specular probes are open-tipped and are not suitable
for powder or liquid sampling.
Adjustable
Probe Holder
74
NIR FlexIR –
NIR Fiber Optic Accessory for Fast and Remote Sample Identification
R emote S ampling
Spectra of incoming pharmaceutical materials measured and verified
with the NIR FlexIR accessory.
Features
• Fast, easy identification of solids and liquid samples in situ
• 2 meter, low-OH fibers providing exceptional throughput
and excellent spectral data with short analysis time
• Spectral range from 1.0 to 2.5 microns (10,000 to 4000 cm-1)
• Integrated, high-sensitivity, extended range InGaAs
detector with electronics connection for your FTIR
spectrometer
with fiber probes
• Standard diffuse reflectance sampling tip with inert
sapphire window for solid samples
• Optional transflectance sampling tip for liquid samples
• Compatible with most FTIR spectrometers configured for
NIR operation
O r d e r i n g I n fo r m a t i o n
Part Number Description
045-10XX
FlexIR NIR Fiber Optic Accessory
Includes base optics mounting for the sample compartment
of your FTIR spectrometer, electronic cabling, diffuse
reflectance probe and probe stand.
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Your FTIR spectrometer must be configured with NIR beamsplitter and NIR source
for optimum performance of the FlexIR accessory. Your FTIR spectrometer must be
capable of interfacing with an external detector.
S ampling O ptions
Part Number Description
045-2001
Liquids Sampling Tip for FlexIR, 1.0 mm pathlength
045-2000
Liquids Sampling Tip for FlexIR, 1.5 mm pathlength
045-2002
Liquids Sampling Tip for FlexIR, 2.0 mm pathlength
R eplacement P arts
Part Number Description
045-2010 Diffuse Reflectance Tip for NIR FlexIR probe
045-7051
NIR FlexIR Probe Stand
608-274-2721
Note: The Liquids Sampling Tip is screw-mounted and easily exchanged with the
solids sampling tip on the FlexIR sampling probe.
www.piketech.com
The PIKE Near-IR (NIR) FlexIR™ fiber optic accessory is an excellent
tool for remote and speedy analysis of a wide variety of materials.
Powders, plastics, coatings, and liquid samples are readily
measured – typically within 30 seconds. The NIR FlexIR is ideal
for performing incoming QC of materials used in pharmaceutical,
polymer, and chemical manufacturing.
NIR sampling is fast and efficient as it eliminates the need for
sample preparation. The NIR FlexIR accessory further speeds analysis
since the probe tip simply contacts the sample, often in drums, and
the spectrum is collected. Powdered samples packaged within a
plastic bag can be analyzed without removal from the bag, which
further speeds analysis time and eliminates analyst exposure to
chemical materials.
The NIR FlexIR is designed for maximum throughput and
performance. The fiber optic cable is directly coupled to the
integrated indium gallium arsenide (InGaAs) detector – eliminating
energy loss due to additional transfer optics and beam divergence.
With the optional Liquids Sampling Tip, it is easy to identify
incoming liquids by inserting the wand tip into the liquid sample
and collecting its spectrum.
The NIR FlexIR accessory is built and tested for optimum
performance for your FTIR spectrometer.
Spectra of incoming liquid materials measured and verified with the
NIR FlexIR accessory.
Pike Technologies
• Standard SMA connectors providing maximum flexibility
75
Extending Your Sample Compartment
Mid-IR Remote Sampling – Introduction and Applications
Fourier transform infrared (FTIR) remote sampling offers a viable
solution for the analysis of samples which are not conducive to the
use of traditional FTIR sampling accessories due to constraints posed
by the size of a bench-top instrument’s sample compartment or the
nature of the sample. Taking an IR probe to a sample is desirable
in numerous applications and a necessity in others. Examples of
remote IR sampling may be found across many fields. In the fine
arts, priceless paintings and artifacts may be analyzed with limited
sample handling. Mid-IR analysis of intractable samples such as
large painted panels may be conducted. Biomedical applications
encompass soft tissue and skin analysis. In chemical production,
remote sampling allows for reaction monitoring and the analysis of
samples restricted to glove boxes and fume hoods.
PIKE Technologies offers the next generation of commerciallyavailable FTIR remote sampling accessories with the Mid-IR FlexIR.
Hollow waveguides (HWGs), the cornerstone of these mid-IR remote
sampling accessories, offer enhanced performance characteristics
compared to traditional mid-IR optical fibers. The most popular type
of HWGs consists of reflective coated silica tubing. The inner portion
of silica tubing is coated with Ag followed by converting some of the
Ag to AgI to form a dielectric layer, which exhibits a highly reflective
and very smooth surface. The exterior of the silica tubing is coated
with acrylate polymer to provide additional strength.
Acrylic polymer coating
Hollow core
Agl
Silica tubing
Ag
Hollow waveguide
HWGs used in the design of the Mid-IR FlexIR accessory
address many of the limitations found with the use of traditional
chalcogenide glass and silver halide polycrystalline fibers.
Chalcogenide fibers exhibit a strong absorption band located near
2170 cm-1 due to S-H or Se-H bonds; as a consequence, the signalto-noise ratio (SNR) in this spectral region is significantly decreased.
To address this issue, two different fiber types, chalcogenide and
silver halide, are often employed to generate a full spectral range.
The chalcogenide fiber generally used in mid-IR spectroscopy covers
approximately 6500–2250 cm-1 and 2050–1000 cm-1 while the silver
halide fiber covers 2100–600 cm-1. In contrast, HWGs are capable of
spanning a wide spectral range from 11,000 to 700 cm-1 eliminating
the need for a complementary fiber set. The spectral range of the
Mid-IR FlexIR accessory is dependent on the probe type and the
configured detector.
Durability of traditional fibers has been a concern and a
hindrance in past mid-IR remote sampling accessories. Additionally,
intrinsic flaws originating during the manufacture of glass fibers
significantly increase fiber fragility, and may often result in
catastrophic failure under routine application use. Furthermore,
the bend radius of traditional fibers are limited. Contrary to these
properties, HWGs offer a robust means of delivering and collecting IR
radiation and offers a smaller bend radius.
76
For ultimate flexibility the Mid-IR FlexIR offers a choice of
detector, either a liquid nitrogen MCT detector for applications
that require high sensitivity or a DTGS detector for applications
that require less sensitivity yet desire the convenience of a room
temperature detector. Two models of MCT detectors are available
(narrow-band and mid-band) to allow the optimization of signal-tonoise ratio and spectral range. The MCT detector is mounted on the
base optics while the DTGS detector is nested in the probe tip.
The sample probe is permanently aligned to the HWG for
consistent analysis results. A variety of probes are available
covering ATR, diffuse reflectance, and specular reflectance sampling
techniques. Three ATR crystal offerings are zinc selenide (ZnSe),
germanium, and diamond/zinc selenide composite. Fiber length is
1 or 2 m.
To illustrate the diverse capabilities of the newest technology
in mid-IR remote sampling – the Mid-IR FlexIR, three application
examples will be presented highlighting applications using
attenuated total reflectance (ATR), diffuse reflectance and specular
reflectance sampling probes.
Biomedical Application: ATR Probe
The simplicity of ATR sampling has led to its use in numerous
biomedical applications. Confining the ATR crystal sampling surface
to an FTIR sample compartment limits in vivo studies.
Remote ATR sampling, however, expands the flexibility of FTIR
studies and applications in this field. For example, remote ATR
sampling makes it possible to investigate chemical diffusion through
the skin, residual chemicals retained on the skin from body lotions
and washes and the investigation of skin aberrations.
The objective of this biomedical application was to investigate
residual chemicals found on human skin after the application of a
commercially-available sunscreen spray. A spectrum was collected
before and after the application of the skin care product using the
FlexIR ZnSe ATR probe.
Spectral data of untreated skin clearly shows the IR chemical
signature of skin including the amide I and amide II bands at 1650
and 1550 cm-1, respectively. The result from spectral subtraction
allows for the investigation of the sunscreen chemicals remaining on
the skin (Figure 1). Capabilities of collecting in vivo data allow for the
optimization of formulations and the study of time-based efficacy of
existing products and those in the product development stage.
Figure 1. Spectra of untreated and treated skin.
Intractable Panels:
Diffuse Reflectance and Specular Reflectance
Pike Technologies
Figure 3. Spectrum of a coating on aluminum.
HWGs bring new technology to mid-IR remote sampling
accessories. The diversity of sampling probes covering ATR, diffuse
reflectance and specular reflectance used in conjunction with HWGs
and high precision optics offers the capability to collect quality
spectra of a wide range of samples, which may be prohibited with
traditional in-compartment FTIR sampling accessories.
R emote S ampling
Reflective-type measurements may be classified as either diffuse
or specular. Coatings and thin films on reflective substrates are
candidates for specular reflectance measurements. Using this
sampling technique, the reflected beam from the sample is collected
at an angle of incidence equal to that of the incoming beam as it is
delivered to the sample. Diffuse samples scatter the reflected beam
across a wide range of angles and in IR sampling must be gathered
using a collection optic.
To illustrate non-destructive mid-IR testing using remote
sampling, two intractable samples were analyzed. One sample
consisted of a coating on a smooth reflective surface, conducive
to specular reflectance measurements. The other sample type
had a painted diffuse surface. Figure 3 shows the spectrum of a
coating on a smooth reflective surface obtained by using the Mid-IR
FlexIR configured with a specular reflectance probe, and Figure 4
shows spectra of painted diffuse panels collected with the diffuse
reflectance probe. The two diffuse painted panels clearly show
differing chemical properties. In each sample the high SNR results in
quality spectra. The spot size of both probes is 2.5 mm in diameter
allowing for concise measurements of small defects. Remote
sampling offers a convenient method of non-destructive analysis.
Conclusions
www.piketech.com
Figure 4. Spectrum of a panel with diffuse finish.
608-274-2721
77
78
Extending Your Sample Compartment
Notes
Microsampling
For samples considerably smaller than a typical 8–10 mm IR
beam, microsampling accessories and microhandling tools
make ideal additions to your FTIR spectrometer. Our microsampling accessories demagnify the FTIR beam to a smaller
dimension, thereby increasing IR throughput for small samples.
µMAX™ FTIR Microscope Page 80
Transmission, reflection and ATR analysis
of micro samples
Microsampling Tools Page 83
Sample handling tools for microanalysis
Micro Diamond Cell Page 84
Compressing and holding samples
for microanalysis
S-100R Heated Microscope Stage Page 85
Temperature measurements under vacuum
or controlled gas flow
4X and 6X Beam Condensers Page 86
Transmission measurements of micro samples
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
From Microns to Millimeters
µMAX –
Sample Compartment Microscope for FTIR
The µMAX™ is an optical design for IR microanalysis providing highperformance sampling at low-cost with exceptional ease-of-use. The
µMAX fits into the sample compartment of most FTIR spectrometers.
The compact, planar optical layout minimizes the pathlength of the
IR beam and thereby maximizes IR throughput.
All operations with the µMAX are intuitive and made even
easier with standard Dichroic Optics which provides full viewing
of the sample while collecting IR spectra. With Dichroic Optics you
can view the sample area and simultaneously search for appropriate
IR spectral content – greatly speeding microanalysis. The fully
variable X, Y, θ see-through aperture for transmission provides
optimized sample dimensioning – for getting the maximum IR
signal from every sample.
The µMAX IR microscope uses a 7.45X Schwartzschild objective
and condenser to focus the IR beam onto the sample and provide
excellent sample visualization – better than 1-micron visible image
resolution. An optional CCD camera enables video image projection
onto the PC. With the Dichroic Optics of the µMAX and spectral
preview of the FTIR software one can view changing IR spectra and
sample position in real-time on the PC.
The µMAX is the first sample compartment IR microscope
accessory capable of all microsampling modes – transmission,
reflection and ATR. The µMAX fits into the sample compartment,
using the spectrometers detector for convenience and sampling
flexibility. For relatively larger micro samples (100 microns and
greater) the DTGS detector provides excellent performance with
the µMAX and enables full mid-IR spectral range coverage to
450 cm-1. For smaller micro samples to 20 microns in size an
MCT detector is recommended.
Features
• Compact sample compartment design to save lab space
• Uses FTIR detectors – DTGS or MCT
• Available in transmission, reflection and ATR modes
• High throughput optical design
• Simultaneously view and collect spectrum
• Easy-to-use, robust design
• Available for most FTIR spectrometers
• Trinocular with USB camera option
• Low-cost
80
Transmission spectra of polystyrene film at aperture sizes of 200 x 200,
100 x 100, and 50 x 50 microns using the µMAX IR Microscope and the
DTGS detector of the FTIR spectrometer (spectra were collected at 4 cm-1
spectral resolution using a 2-minute collection time).
Transmission spectra of polymer laminate sample using DTGS
detector. Samples held in PIKE Micro Compression Cell.
Micro reflection spectrum of a coating on a reflective base metal,
200 x 200 micron sampling area using DTGS detector.
ATR is an excellent sampling option for the µMAX IR microscope.
The RotATR™ is a unique, pivot-designed germanium ATR providing
easy and precise operation and excellent micro ATR spectra. Focus and
select the sample area, rotate the ATR crystal into sample position,
make sample contact and collect the IR spectrum.
The Micro Diamond Cell is an excellent option for use with the
µMAX IR Microscope. Tiny chips or fiber segments can be flattened to
obtain excellent transmission spectra.
Micro
Diamond Cell
Single drug crystal identified as benzocaine flattened in the Micro
Diamond Cell. Data collected using DTGS detector.
Specifications
Sampling Modes Transmission, Reflection and ATR
Objective 7.45X Schwartzschild, N.A. 0.64, fixed for
sturdy, permanent alignment
Micro ATR RotATR with 100 micron tip, pivot pinnedin-place and easily removable for maximum
sample area access. Universal Ge crystal for
analysis of all micro samples.
Sample Stage Z focus including X, Y slide sample holder,
with 20 x 50 mm travel
IR Collection/Sample Dichroic Optics reflect IR energy and transmit
Viewingvisible, providing continuous view of the
sample during data collection. Dichroic Optics
eliminate the need to switch optics from view
sample to collect spectrum.
Illumination Köhler, variable intensity, 50 watt
Micro ATR works exceptionally well with the µMAX IR
microscope. The 100-micron flat-tipped micro ATR crystal makes
intimate contact with the sample easily achieved, providing high
spectral quality as seen in the data above.
Sample Masking X , Y, θ variable glass aperture for transmission
sampling to view sample and surrounding
sample area. Standard pinhole aperture slide
for reflection sampling.
Sample Viewing Binocular or Trinocular Viewer with 10X eyepieces. Standard eyepiece reticule for sample
dimensioning, optional video camera with
USB interface.
Visible Field of View 1600 microns
Visible Image Contrast Better than 1 micron
Detector Uses standard detectors of the FTIR, typically
DTGS and MCT
Purge Includes purge tubes and purge inlet for
additional purge. Compatible with sealed and
desiccated FTIR spectrometers.
Regulatory RoHS and CE Mark compliant
Please contact PIKE Technologies for additional product details.
608-274-2721
Station In sample compartment, fits most FTIR
spectrometers. Mounted on a baseplate for
the FTIR spectrometer.
PIKE Technologies
Micro Compression Cell
www.piketech.com
Pike Technologies
Optional Condenser 7.45X Schwartzschild, N.A. 0.64, Z-adjust to
optimize sample focus
Micro ATR spectra of a 40 micron carpet fiber (upper – blue) and a
50-micron caffeine crystal (lower – red) using DTGS detector.
M icrosampling
Switching from transmission to reflection on the µMAX is easy
with a thumb wheel selection. Reflection sampling area is defined
by use of the aperture slide with pre-defined sizes from 40 to 1000
microns. Micro reflection analysis of small areas of interest on
reflective surfaces is made easy with the PIKE Technologies µMAX.
Simply focus and position the sampling stage, select the sample
area with the aperture slide and collect the spectrum. The
background spectrum is collected using the same dimension
aperture using the gold-surfaced reference slide.
81
O r d e r i n g I n fo r m a t i o n
From Microns to Millimeters
Bundled µMAX Packages
Part Number Description
034-21XXComplete µMAX Sample Compartment IR Microscope with
transmission, reflection, Ge ATR and video camera
034-22XXµMAX Sample Compartment IR Microscope with
transmission, reflection and Ge ATR
M icrosampling O ptions
Part Number Description
034-3060
Micro Compression Cell for 13 mm IR transparent windows
160-1135
Window, KBr, 13 mm x 2 mm
034-41XXComplete µMAX Sample Compartment IR Microscope
for reflection, Ge ATR and video camera
162-0030 Micro Plane, carbide blade
162-0040
Micro Plane, diamond blade
034-42XXµMAX Sample Compartment IR Microscope with
reflection and Ge ATR
162-0010
Micro Diamond Cell, 1.6 mm
162-0020
Micro Diamond Cell, 2.0 mm
162-0045
Micro TouchPick Pen Set
Includes pen with tip size 0.62mm, pen with tip size
0.17mm, scalpel/roller knife, cleaning compound
and holder case
Configurable µMAX Systems
162-0046
Diamond Window, 2.5 mm
µMAX B ase O ptics
162-0047
Diamond Window, 3.5 mm
162-0048
Micro Vice-Mini
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
All bundled µMAX packages include trinocular viewer, slide aperture for reflection,
X, Y sample stage, microsampling kit, spectrometer base mount, purge tubes and
storage case. Transmission versions include X, Y, θ variable see-through aperture.
Part Number Description
034-20XX
µMAX Sample Compartment IR Microscope
for transmission and reflection (ATR optional)
Note: For additional product information, see the microsampling tools section.
034-40XXµMAX Sample Compartment IR Microscope
for reflection (ATR optional)
µMAX IR M icroscope U pgrades
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
The µMAX Sample Compartment IR Microscope is available in versions for
transmission and reflection sampling or reflection only – both versions are also
compatible with ATR sampling. RotATR µMAX ATR must be purchased separately.
Both versions include slide aperture for reflection, X, Y sample stage, microsampling
kit, spectrometer base mount, purge tubes, and storage case. Transmission version
includes X, Y, θ variable see-through aperture.
034-0090
S ample V iewing O ptions (must select one or more)
Part Number Description
034-3020
Binocular Viewer for µMAX
034-3030
Trinocular Viewer for µMAX
034-3010
Video Camera for µMAX
Notes: Trinocular Viewer is required for selection of the Video Camera option.
Binocular and Trinocular Viewers include adjustable reticule to assist with sample
dimensioning.
M icro ATR (optional)
Part Number Description
034-3040
RotATR, µMAX ATR, Ge Crystal
Note: The RotATR micro ATR is compatible with the µMAX Sample Compartment
IR Microscope.
82
Sampling Options, Upgrades and Replacement Parts
Part Number Description
µMAX IR Microscope Transmission Upgrade
Notes: Transmission Upgrade requires shipment of the accessory to PIKE
Technologies. Upgrade includes µMAX condenser, X, Y, θ variable see-through
aperture, and all additional optics required for transmission, reflection and optional
ATR sampling.
µMAX IR M icroscope R eplacement P arts
Part Number Description
300-0025
Gold-Surfaced Disk, 13 mm, for reflection analysis
034-3070IR Microsampling Kit
Includes 3-position sample slide with gold mirror, 2 KBr
windows, scissors, tweezers, probes and roller knife with replacement blades
162-6401
3-position Sample Slide for 13-mm windows
300-0002
Gold-Surfaced Sample Slide
034-3080
Replacement Illumination Bulb for µMAX
Note: For options not listed here, please contact PIKE Technologies.
Microsampling Tools –
Compression Cells and Sample Manipulation
Diamond Window
An excellent sampling tool for supporting small samples for
transmission analysis with the PIKE µMAX IR microscope. Single
crystals, flattened fibers, multi-layer polymer micro samples
are firmly supported between salt windows – typically KBr for
transmission analysis. The cell uses 13 x 2 mm windows and
has a clear aperture of 10 mm. Compression
of the sample is achieved
by rotation of the
knurled retainer.
Offers a durable, multi-use window for microscopic transmission
measurements spanning from the UV to the far-IR regions. Two
diamond sizes are available, 2.5 and 3.5 mm and are secured in a
13-mm diameter housing which may be used with the 3-Position
Sample Slide (sold separately). The diamond is Type IIa.
Micro Plane with either Carbide or Diamond Blade
3-Position Sample Slide
A useful tool for preparation of thin slices of multi-layered samples
for transmission microanalysis. The Micro Plane is available with
either carbide or diamond blade. The carbide blade is recommended
for general polymer materials. The diamond blade is recommended
when the multi-layered sample has metallic content. The
Micro Plane features an adjustable knife edge
to control sample thickness.
The PIKE 3-Position Sample Slide is designed for placement of
13-mm windows for transmission analysis or the 13-mm goldsurfaced disk for reflection analysis when using the µMAX IR
Microscope. An open port of the 3-Position Sample Slide is used
conveniently to support a flattened free-standing fiber for
transmission analysis.
M icrosampling
Micro Compression Cell
Micro TouchPick Pen Set
A multi-use sample holder fitting most microscope stages including
IR, Raman and light microscopes. It makes holding round and
unevenly-shaped samples easy. It may tilt the sample for correcting
oblique sample orientation, and may be used to
stretch fibers and polymer films.
M icrosampling T ools
Part Number Description
034-3060
Micro Compression Cell
(requires selection of two 13 x 2 mm windows)
160-1135
Window, KBr, 13 x 2 mm (1 ea.)
160-1008
Windows, KBr, 13 x 2 mm (6 pack)
162-0030
Micro Plane, carbide blade
162-0040
Micro Plane, diamond blade
162-0045
Micro TouchPick Pen Set
m, Includes pen with tip size 0.62 mm, pen with tip size 0.17 m
scalpel/roller knife, cleaning compound and holder case
162-0048
Micro Vice-Mini
162-0046
Diamond Window, 2.5 mm aperture
162-0047
Diamond Window, 3.5 mm aperture
300-0025
Gold-Surfaced Mirror, 13 x 2 mm
034-3070IR Microsampling Kit
Includes 3-position sample slide with gold mirror, 2 KBr
windows, scissors, tweezers, probes and roller knife with replacement blades
Note: For items not in this list please contact PIKE Technologies.
608-274-2721
162-64013-Position Sample Slide
(recommended selection of window or disk)
www.piketech.com
Micro Vice-Mini
O r d e r i n g I n fo r m a t i o n
Pike Technologies
Ideal for the delicate maneuvering of your specimens. The benefits
are excellent control of sample handling, ease of handling fragile
and statically charged samples, and no residue is left on the sample.
The ergonomic pen set includes two pens with different sized
adhesive tips (0.17 and 0.62 mm), special cleaner and a
roller knife.
83
From Microns to Millimeters
Micro Diamond Cell –
For Compressing and Holding Samples for Microanalysis
Features
• Compression and positioning for micro samples
• 1.6-or 2.0-mm clear aperture versions
• Easy thumb wheel mechanism for application of pressure
• Compatible with UV to far-IR spectral regions
• Compatible with PIKE µMAX IR microscope and
Small samples are easily held in place and flattened to ideal
thicknesses for FTIR analysis using the PIKE Technologies Micro
Diamond Cell. The diamond windows in this cell are Type IIa
synthetic for excellent transmission from the UV through far-IR
spectral regions. The hardness of diamond enables maximum
pressure to be applied to all types of crystalline, fiber, or amorphous materials. Typical samples include fibers, paint chips,
rubbers, and plastic materials including laminates.
The large clear aperture of the PIKE Technologies Micro
Diamond Cell (either 1.6 or 2.0 mm) makes it easy to place the
micro sample into position while viewing under a stereomicroscope.
The large thumb wheels provide easy means of tightening and
flattening the samples.
The PIKE Technologies Micro Diamond Cell is mounted on a
standard 2” x 3” plate compatible with your FTIR spectrometer
sample compartment. However, it performs best with a beam
condenser or IR microscope. Cell thickness is 9.3 mm fully assembled.
beam condensers
• 14,000 psi pressure (10 kgf/mm2)
Human hair sample flattened in the PIKE Micro Diamond Cell and
analyzed using the µMAX IR microscope.
O r d e r i n g I n fo r m a t i o n
Part Number Description
162-0010
Micro Diamond Cell, 1.6 mm
162-0020
Micro Diamond Cell, 2.0 mm
Notes: The Micro Diamond Cell is easily placed onto the X, Y stage of the PIKE
µMAX IR microscope. Mounting the Micro Diamond Cell into the PIKE beam
condensers requires the optional slide holder.
84
Compact Transmission/Reflection S-100R Microscope Heat Stage
– High-Temp Measurements under Vacuum or Controlled Gas Flow
• Compact design fits most stages of FTIR and Raman
microscopes
• Direct transmission measurements in sample
M icrosampling
Features
The stage features a lightweight aluminum body that is 16-mm
thick. The sample is located between two IR transparent windows
(transmission measurements) or between the IR reflecting mirror
and single window (trans-reflection configuration). Samples can
be easily loaded and removed by twisting the upper window plate
by hand. Optional inserts for varying sample sizes and shapes are
available and a wide selection of window materials can be used with
the stage.
The accessory can be used under ambient conditions or
under vacuum. Pressure up to 0.5 MPa is possible with appropriate
windows. In addition, inert or reaction gas can be flowed through
the stage chamber. Valves and connectors required for these special
configurations should be ordered separately.
Temperature range of the S-100R Microscope Heat Stage spans
from ambient to 600 °C, and is controlled with +/- 0.5% accuracy
by digital controllers available in PC or dedicated configurations.
PC option provides graphical parameter setup, ramping and USB
connectivity. Liquid cooling is integrated into the accessory base
in order to minimize heat transfer to the microscope stage, improve
temperature stability and aid the cooling process.
compartments of FTIR spectrometers
• Precise temperature control up to 600 °C
• Vacuum, reaction gas or inert gas chamber environment
• Easy sample loading, assembly and disassembly
The S-100R Microscope Heat Stage is designed for spectroscopic
analysis and monitoring of small samples at varying temperatures.
The accessory can be located directly on the sampling stages of
most FTIR and Raman microscopes. It can also be used for
transmission measurements when placed in the sample
compartment of the spectrometer.
Aperture
Maximum: 4 mm, Minimum: 1 mm
Chamber Window 20 mm x 2 mm
Sample Port Window 13 mm x 1 mm
Stage Weight Temperature Control
Temperature Range
S-100R Digital Temperature Controller
(1) 20 x 2 mm and (1) 13 x 1 mm for reflection measurement
(2) 20 x 2 mm and (1) 13 x 1 mm for transmission measurement
Part Number Description
160-1134
Disk, KBr, 20 x 2 mm
Disk, BaF2, 20 x 2 mm
1/16” Swagelok®
4-mm quick connection (optional)
84 x 100 x 16 mm
0.5 kg
160-5003
Disk, KBr, 13 x 1 mm, max temp 300 °C
160-1149 Disk, BaF2, 13 x 1 mm, max temp 500 °C
160-5001
Disk, CaF2, 13 x 1 mm, max temp 900 °C
Note: Maximum temperature restriction applies to sample window. The
temperature of the outer windows is significantly less due to required liquid
recirculated water flow.
O ptions and R eplacement P arts
Ambient to 600 °C
Part Number Description
Accuracy
+/- 0.5%
162-4114
Plate for Motorized Microscope Stage*
Type K thermocouple
162-4115
Slide Mount for transmission measurements, 2” x 3”
162-4116
Holder for 1, 2, 3-mm diameter samples
162-4109
Gas Valve, 1/16” (gas connection) – 2 needed
Sensor Type
Temperature Controllers
Digital
+/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Input Voltage
Output Voltage
Controller Dimensions
(W x D x H)
162-4110
Quick Connector for external circulating liquid – 2 needed
115/230 VAC, user-selectable
162-4111
Reference Mirror, 13 x 1 mm
115 VAC/80 W max.
170-1100
Liquid Recirculator
130 x 230 x 210 mm
*Must provide information for microscope make and model
608-274-2721
Resistive heating
www.piketech.com
S-100R Digital Temperature Controller, PC Control
076-2260
Disk, CaF2, 20 x 2 mm
Pressure Maximum0.5 MPa (requires BaF2, CaF2, ZnSe,
SiO2 windows)
Stage Dimensions
(W x D x H)
076-2460
160-1148
Part Number Description
160-1144
Vacuum Achievable
Gas Connection
T emperature C ontrollers (must select one)
1 x 10-3 Torr
Leak Rate
Coolant Connection
S-100R Microscope Heat Stage
Includes holders for 1, 2, and 3-mm samples, coolant
tube and 13 x 1-mm reference mirror
Less than 1 x 10-9 Pa/m3 per second
162-4186
W indows (must select)
Stage BodyAluminum
Part Number Description
Pike Technologies
Specifications
O r d e r i n g I n fo r m a t i o n
85
From Microns to Millimeters
Beam Condensers –
4X and 6X Versions for FTIR
Wing of fruit fly within 1-mm aperture with and without use of a
beam condenser.
Features
• 4X and 6X versions – providing improved spectral data for
microsampling
• High optical throughput – beam condensing optics provide
higher signal-to-noise ratio for small samples
• Standard pin mounting for sample holders – providing a
precise, reproducible mount for samples
• Standard sample holder block and alignment pinhole
(1.5 mm)
• A variety of optional sample holders
• Enclosed accessory for complete purging
Beam condensers offer easy transmission sampling with minimal sample preparation. The PIKE Technologies beam condensers
are available in 4 and 6 times beam demagnification. The system
design incorporates a layout of six mirrors, adjustable input and
output mirrors and two matched 4:1 (or 6:1) ellipsoidal mirrors.
Both provide a large working area to accept many types of transmission sampling accessories, including high-pressure diamond
cells, liquid cells, mull cells, and micro holders. The sample area
uses pins to ensure accurate and reproducible accessory alignment
requiring no further adjustment. Either 4X or 6X beam condensers
are available in standard or gold-coated optics for high-performance
mid-IR or near-IR operation.
For the most demanding applications, a precision X, Y, Z
Sampling Stage is available as an option, which accommodates
all sampling accessories to achieve the highest possible optical
throughput and allows a point-by-point surveying of an extended
sample.
Basic beam condenser products have been available for many years.
The PIKE Technologies Beam Condenser Accessories provide all
the functionality of these basic systems with exceptional optical
design and easy access to the sampling area. The unique enclosed
optics provide a purged environment.
X, Y, Z Adjustable
Sample Position
Beam Condenser optical diagram
86
Sample Holders for the PIKE Beam Condensers
A range of sample holders are available for making sample
positioning easier. These may be mounted on the X, Y, Z stage for
precision positioning or on the standard mount.
Specifications
OpticsAll reflective, aluminum (standard)
Gold-coated (optional)
Configurations
4X and 6X demagnifications
Sampling OptionsStandard sample holders
X, Y, Z adjustable stage
Pressure diamond cells and
micro holders
Universal Spring Sample Holder
– ideal for small spheres and gems
Dimensions165 x 242 x 114 mm (4X)
(W x D x H) 165 x 318 x 114 mm (6X)
FTIR Compatibility
Most, specify model and type
O r d e r i n g I n fo r m a t i o n
4X and 6X B eam C ondensers
Part Number Description
Magnetic Sample Holder
– ideal for 1 or 3-mm pellet die
031-40XX
4X Beam Condenser
Includes the Non-Adjustable Sample Position Stage,1.5 mm
alignment aperture, purge tubes and mount for the FTIR
of your selection
M icrosampling
PurgeableYes
031-60XX6X Beam Condenser
Includes the Non-Adjustable Sample Position Stage, 1.5 mm
alignment aperture, purge tubes and mount for the FTIR
of your selection
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Contact PIKE Technologies for gold-coated mirror option.
A djustable S ample P osition (optional)
Micro KBr Pellet and Mull Holder
– ideal for very small volume
solids, liquids and paste samples
(holds 13-mm windows)
Part Number Description
031-2010 X, Y, Z Adjustable Sample Position Stage
Note: The X, Y, Z Adjustable Sample Position Stage can be easily exchanged
with the Non-Adjustable Sample Position Stage.
Part Number Description
031-2030
Universal Spring Sample Holder
031-2040
Magnetic Sample Holder
031-2050
Micro KBr Pellet and Mull Holder
Note: All of these sample holders fit to the pin position of either the
Non-Adjustable Sample Position Stage or the X, Y, Z Adjustable Sample
Position Stage.
Pike Technologies
S ample H olders (optional)
M icro D iamond C ell (optional)
162-0010
Micro Diamond Cell, 1.6 mm
162-0020
Micro Diamond Cell, 2.0 mm
031-2070
Mounting Stage for Micro Diamond Cell
Notes: Micro Diamond Cell includes anvil pressure cell assembly and
Type IIa diamonds. Stage for Micro Diamond Cell is required for use with
beam condenser.
B eam C ondenser R eplacement P arts
Part Number Description
Non-Adjustable Sample Position Stage
Note: For options not listed here, please contact PIKE Technologies.
608-274-2721
031-2020
www.piketech.com
Part Number Description
87
From Microns to Millimeters
Notes
88
Transmission
Transmission sampling is a popular method for the collection of
infrared spectra for qualitative or quantitative analysis. Samples
range from solids to liquids and gases. Applying automation
technologies to transmission sampling can improve precision and
workflow efficiency.
Automated Vertical Accessories Page 90
Multi-SamplIR™ and RotatIR™
Automated Horizontal Multi-Sample System Page 92
High capacity sampling
XY Autosampler Page 93
For high-throughput microplate format sampling
Liquid Cells Page 95
For comprehensive sampling of liquids
Dies, Presses, Grinders Page 103
For complete solids preparation
Holders, Windows, Polishing Kit Page 110
For optimizing transmission sampling
Gas Cells Page 115
Short-Path, Long-Path and Heated
For comprehensive gas sampling
Theory and
A pplications
Page 123
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Automated and Manual Technologies
Transmission Multi-SamplIR –
Automated In-Sample Compartment Accessory
Each system incorporates two precision stepper motors for
rotation and translation of the plate. The motors are driven by the
PIKE Motion Control Unit.
The operation is managed by PIKE Technologies’ AutoPRO
software, which provides full user programmability and an easyto-learn “point-and-click” environment. Polar or X, Y coordinates may
be used to define test points. AutoPRO software allows complex test
sequences to be set up, stored as methods and implemented with
full flexibility. Spectral data collection of pre-defined positions may
be initiated through AutoPRO when using most FTIR spectrometers.
The USB Motion Control Unit incorporates a smart power supply and
works with 85–265 VAC, 47–63 Hz power lines.
The Transmission Multi-SamplIR accessory is designed to fit
most FTIR spectrometers. Please contact us for more product details.
Features
• In-compartment automated transmission sampling
• Selectable number of samples, size, configuration
and placement
• Multiple point analysis on single sample
• Custom sampling plates
• Fully automated and manual versions available
The PIKE Technologies Transmission Multi-SamplIR accessory is
designed to speed FTIR analysis. The accessory accommodates up
to 18 samples (depending on sampling plate configuration) for
unattended analysis. Flexible test sequences are easily defined and
automatically implemented. This Multi-SamplIR is ideal for analyzing
a wide range of materials including films, slides, pellets, windows and
large area samples like multilayer coated substrates.
Samples are conveniently mounted onto a sampling plate
and held in place during the analysis. The plates can be configured
for different sample quantities, types and geometries. The system
can be set to perform automated mapping of the sample, producing
transmission spectra as a function of position. Sampling plates
are easily mounted on the support ring with spring-loaded clips,
ensuring that the plate remains precisely located and correctly
registered. The support ring mounts on the accessory’s drive and
is rotated and translated laterally through a distance of 75 mm to
produce an R-theta motion covering the entire sampling range of
the accessory.
90
AutoPRO software configured for the Transmission Multi-SamplIR.
O r d e r i n g I n fo r m a t i o n
Part Number Description
074-26XX
Automated Transmission Multi-SamplIR for FTIR
Includes AutoPRO software and a motion control unit
(85–265 VAC), and a Standard Sampling Plate for 13-mm
pellets (18 positions)
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
This accessory requires a minimum FTIR beam height of 3.5”.
O ptions
Part Number Description
074-3661
Additional Standard Sampling Plate
Note: If you need custom sampling plates or options not described here, please
contact us.
RotatIR –
Automated Rotating Sample Stage
T ransmission
The RotatIR features a standard 2 x 3” slide mount for easy
positioning of different types of transmission sample holders.
AutoPRO software allows complex test sequences to be setup,
stored as methods and implemented with full flexibility. The USB
Motion Control Unit incorporates a smart power supply and works
with 85–265 VAC, 47–63 Hz power lines.
The PIKE RotatIR accessory is designed to fit most FTIR
spectrometers. Please contact us for more product details.
Features
• Automated selection of sample transmission angle
• Programmable from 0 to 360 degrees with resolution
of 0.2 degree
• Automated collection of spectra at the defined angle
of transmission via AutoPRO software
• Compatible with most FTIR systems
AutoPRO software for programming pre-defined angles.
O r d e r i n g I n fo r m a t i o n
Part Number Description
091-20XX
RotatIR Automated Rotating Sample Stage
Includes AutoPRO software and a Motion Control Unit
(85–265 VAC)
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
Pike Technologies
The PIKE Technologies RotatIR is designed for automated selection
of the sample transmission angle relative to the IR beam in the
FTIR sample compartment. Applications include the study of
sample thickness and sample reflectivity. Selection of the angle of
transmission is automated through the use of PIKE Technologies
AutoPRO software, the Motor Control Unit and the integrated
stepper motor. Spectral data collection of pre-defined angles may be
initiated through AutoPRO when using most FTIR spectrometers.
O ptions
162-5400
Film Sampling Card, 20-mm clear aperture (10 ea.)
Note: If you need options not described here, please contact us.
608-274-2721
Film sampling cards for
the RotatIR accessory.
www.piketech.com
Part Number Description
91
Automated and Manual Technologies
Automated Horizontal Transmission Accessory –
For Films or Pellets
The operation is managed by PIKE Technologies’ AutoPRO software, which provides full user programmability and an easy-to-learn
“point-and-click” environment. AutoPRO software allows complex
test sequences to be set up, stored as methods and implemented
with full flexibility. Data collection of pre-defined positions may be
initiated through AutoPRO when using most FTIR spectrometers. The
Motion Control Unit incorporates a smart power supply and works
with 85–265 VAC, 47–63 Hz power lines.
The Automated Horizontal Transmission Accessory is compatible
with most FTIR spectrometers.
Features
• Fully automated transmission analysis of polymer films,
pellets or other transmission samples for FTIR
• Standard specular reflectance sampling
• Sampling capacity of up to 114 samples, depending
upon size
• Continuous operation with multiple plates
• Purgeable optical design for high-quality FTIR spectra
PIKE Technologies offers the Automated Horizontal Transmission
Accessory for increasing sample throughput for analysis of films and
pellet samples.
The Automated Horizontal Transmission Accessory is available
in an 8” or a 12” version depending upon sample loading
requirements. The 8” version will accommodate up to 37 25-mm
diameter samples. The 12” version will accommodate up to 83
25-mm diameter samples. PIKE Technologies manufactures custom
sampling plates to meet your exact sampling needs. Please contact
us for other configurations.
Both the 8” and 12” versions are capable of performing specular
reflection analysis as well as transmission analysis, if required for
your application.
The PIKE Autosamplers are controlled by AutoPRO software, with a
point-and-click user environment to define sampling positions.
O r d e r i n g I n fo r m a t i o n
Part Number Description
075-28XX
Automated 8” Horizontal Transmission Accessory
Includes motion control unit (85–265 VAC), AutoPRO
software and one 37-position sampling plate
075-29XX
Purge-Ready Automated 8” Horizontal Transmission Accy
Includes motion control unit (85–265 VAC), AutoPRO
software and one 37-position sampling plate
(order Purge Enclosure separately)
076-28XXAutomated 12” Horizontal Transmission Accessory
Includes motion control unit (85–265 VAC), AutoPRO
software and one 83-position sampling plate
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
P/N 076-28XX is purge-ready; order purge enclosure separately.
O ptions
Part Number Description
075-3881
Additional Sampling Plate for 8” Automated Horizontal
Transmission Accessory
076-3881Additional Sampling Plate for 12” Automated Horizontal
Transmission Accessory
016-3000
Purge Enclosure for 8” Horizontal Transmission Accessory
017-3000
Purge Enclosure for 12” Horizontal Transmission Accessory
Notes: Purge enclosures will not fit all spectrometer models. For more options or
custom plates, please contact PIKE Technologies.
92
XY Autosampler – Transmission and Reflection, Automated
Sampling in Microplate Format
High-quality FTIR spectra of
solvent residues collected with
the XY Autosampler.
Features
T ransmission
A unique 96-well silicon plate is available for mid-IR sample
analysis by transmission. For diffuse reflection measurements
a dedicated plate is available featuring 96 polished cavities for
placement of powder samples. Please contact us if you require
specialized sampling plate configurations.
The XY Autosampler features an X, Y stage with both axes driven
by high-precision servo motors with optical encoders for speed and
reproducibility. USB and DC power are the only external connections
required for this accessory. The transmission option requires a
spectrometer external IR detector port.
Programming and control of the XY Autosampler is done
through PIKE Technologies’ AutoPRO software, which can be
integrated easily with most FTIR software packages.
• Complete hardware and software package for automated
analysis with standard 24-, 48-, or 96-well plates. Special
plate configurations available.
• Diffuse reflectance of powdered samples or specular
reflectance sampling for reaction residues
• Gold-coated optics version for highest performance mid-IR
and near-IR sampling
• Optional transmission sampling with integrated DTGS or
InGaAs detector
• Fully enclosed, purgeable design with CD-style loading tray
• In-compartment mounting, compatible with most FTIR
spectrometers
Optics
Elliptical – 3X beam demagnification
Accuracy
+/- 25 µm
Repeatability +/- 5 µm
Resolution
1 µm
047-22XX
XY Autosampler – Diffuse Reflectance/Transmission
Includes AutoPRO software, integrated DTGS detector,
96-well diffuse reflectance and 96-well transmission
sampling plates
047-62XXXY Autosampler – Diffuse Reflectance/Transmission with
Gold-Coated Optics
Includes AutoPRO software, integrated DTGS detector,
96-well diffuse reflectance and 96-well transmission
sampling plates
047-23XX
XY Autosampler – Diffuse Reflectance/Transmission
Includes AutoPRO software, integrated InGaAs detector,
96-well diffuse reflectance sampling plate
047-63XXXY Autosampler – Diffuse Reflectance/Transmission with
Gold-Coated Optics
Includes AutoPRO software, integrated InGaAs detector,
96-well diffuse reflectance sampling plate
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
For transmission option your spectrometer must be capable of interfacing with an
external detector. A glass-bottom well plate is recommended for NIR transmission
measurements. For diffuse-only options of this accessory, please see the Diffuse
Reflectance section.
O ptions
Part Number Description
Minimum Run Time56 seconds for 96-well plate (actual time is
spectrometer and application dependent)
073-9110
96-Well Diffuse Reflectance Sampling Plate
Computer InterfaceUSB
073-9130
96-Well Si Transmission Sampling Plate
Dimensions (W x D x H)159 x 336 x 141 mm (including micrometer)
Weight
608-274-2721
Mechanical Specifications
Part Number Description
www.piketech.com
Specifications
O r d e r i n g I n fo r m a t i o n
Pike Technologies
The PIKE Technologies XY Autosampler is designed around
standard 24-, 48- or 96-well microplate architectures – ideal for
high-efficiency sample loading and FTIR analysis. The loading tray
moves to a position outside of the accessory for easy loading and
unloading of samples while conserving the purge. This also permits
interface to a robot/autoloader.
Applications include high throughput analysis of liquid residues
and chemical reactions, powdered samples, and automated diffuse
reflection analysis. The XY Autosampler is available with standard all
reflective aluminum optics or with gold-coated optical components
for highest performance in mid-IR and optimized NIR sampling.
The optical design of the XY Autosampler is based upon a
precision ellipsoidal reflector. The size of the spot illuminated
at the sample is approximately 2 mm – ideal for up to 96-well
configurations. The accessory is compatible with most FTIR
spectrometers.
4.6 kg
93
Automated and Manual Technologies
Press-On Demountable Cell –
For Viscous Liquids and Mulls
The PIKE Technologies Press-On Demountable Liquid Cell is
recommended for fast and convenient qualitative analysis of
viscous liquids and mull samples. Simply spot the sample onto
the middle of the transparent IR window and slip the second
window over the top. The windows are conveniently held in place
by the friction fit of the Demountable Cell Holder. The Press-On
Demountable Cell is available in 2 sizes – 25-mm and 32-mm
diameter and has optional Teflon spacers to assist with sampling
pathlength. A wide variety of window types and spacer pathlengths
are available to cover NIR, mid-IR and far-IR spectral regions and
sample composition from organic to aqueous.
The PIKE Technologies Press-On Demountable Liquid Cell is
designed with a standard 2” x 3” plate for use with all FTIR
spectrometers.
Features
• Flexible window selection for optimizing spectral range
and sample compatibility
• Demountable cell design for optimal cleaning of
difficult samples
• Compatible with all FTIR spectrometers
O r d e r i n g I n fo r m a t i o n
P ress -O n D emountable L iquid C ell H olders
S pacers for P ress -O n D emountable L iquid C ell (Optional)
Part Number Description
Part Number
25 mm
32 mm
162-3600
Press-On Demountable Liquid Cell Holder for 25-mm Windows
Includes cell holder, and O-ring
162-3610
Press-On Demountable Liquid Cell Holder for 32-mm Windows
Includes cell holder, and O-ring
W indows for P ress -O n D emountable L iquid C ell
(select minimum of 2)
Part Number
25 x 4 mm
32 x 3 mm
Description
162-1110
162-1210
0.015
162-1120
162-1220
0.025
162-1130
162-1230
0.050
162-1140
162-1240
0.100
162-1150
162-1250
0.200
162-1160
162-1260
0.500
162-1170
162-1270 1.000
162-1190
162-1290
Assortment
160-1217
160-1147
BaF2
160-1211
160-1143
CaF2
160-1138
160-1137
Ge
Notes: Spacer pathlength packages above include 12 each of the spacers.
The assortment package includes 2 each of the different pathlengths.
160-1133
160-1132
KBr
R eplacement P arts
160-1127
160-1126 KRS-5
Part Number Description
160-1124
160-1122
NaCl
162-3621
Viton® O-Rings for barrel, 25 mm (12 ea.)
Viton O-Rings for barrel, 32 mm (12 ea.)
160-5214
160-5216
Polyethylene
162-1330
160-1116
160-1159
Si
162-3620
Teflon® O-Ring, 25 mm (12 ea.)
ZnSe
162-1320 Teflon O-Ring 32 mm (12 ea.)
160-1114
160-1113
Notes: For window compatibility please consult the Materials Properties table on
page 125 of this catalog. For additional window selections please see page 112.
94
Pathlength (mm)
Note: For more options for the Press-On Demountable Liquid Cell, please contact
PIKE Technologies.
Demountable Liquid Cells –
For Versatile Pathlength Liquid Sampling
Cell Holder
Features
• Flexible window selection for optimizing spectral range
T ransmission
The PIKE Technologies Demountable Liquid Cell is ideal for qualitative
and quantitative analysis of liquid samples where it is desirable
to optimize the pathlength for varying samples. It is well suited
for samples where it is useful to disassemble the cell for cleaning.
A wide selection of window types and spacer pathlengths are
available to cover mid-IR, NIR and far-IR spectral regions and sample
composition from organic to aqueous.
The PIKE Technologies Demountable Liquid Cell is designed
with a standard 2” x 3” plate for use with all FTIR spectrometers.
The needle plate includes Luer-Lok™ fittings for easy syringe
filling of the sample. The window size is 32 x 3 mm and the
clear aperture of the cell is 13 mm.
An O-ring seal option of the demountable cell replaces the
flat sealing gasket with two small O-rings to seal around the
drilled window filling holes. This modified needle plate version is
recommended for users with highly volatile, low surface tension
samples and low pressure flow experiments.
Gaskets
Spacer
O-Ring
and sample compatibility
• Flexible pathlength to optimize sample absorbance
• Demountable cell design for optimal cleaning of
difficult samples
Windows
• Compatible with all FTIR spectrometers
• Temperature control version available (see page 98)
Needle Plate
Demountable liquid cell assembly layout.
O r d e r i n g I n fo r m a t i o n
S pacers for D emountable L iquid C ell (optional)
Part Number Description
Part Number 162-1100
Demountable Liquid Cell Holder
Includes cell holder, gaskets and one complete set
of spacers – select windows below
162-1210
0.015
162-1220
0.025
162-1200
Demountable Liquid Cell Holder with O-ring Seal
Includes cell holder, gasket, perfluoroelastomer O-rings and
one complete set of spacers – select windows below
162-1230
0.050
162-1240
0.100
162-1250
0.200
162-1260
0.500
Notes: Requires selection of windows. Please select 2 syringes from the next column
for filling the demountable liquid cell.
(must select minimum of 1 Plain and 1 Drilled)
Part Number
Plain
Drilled Description
162-1270
1.000
162-1290
Assortment
Notes: Spacer pathlength packages above include 12 each of the spacers. The
assortment package includes 2 each of the different pathlengths.
160-1147
160-1146
BaF2
R eplacement P arts
160-1143
160-1142
CaF2
Part Number Description
160-1137
160-1136
Ge
162-1104
Demountable Liquid Cell Needle Plate
KBr
162-1113
Demountable Alignment Caps (2 ea.)
Nylon Leur Caps (2 ea.)
160-1132
160-1131
160-1125
KRS-5
160-1122
160-1121
NaCl
162-1300
Teflon Stoppers for Needle Plate (12 ea.)
Teflon Gaskets (12 ea.)
160-5216
160-5215 Polyethylene
162-1310
160-1159
160-1158
Si
162-1320
Teflon O-Rings (12 ea.)
ZnSe
161-0520
Glass Syringe, 1 mL
161-0521
Glass Syringe, 2 mL
161-0522
Glass Syringe, 5 mL
160-1113
160-1112 Notes: Demountable Liquid Cell Holder with O-ring Seal (PN 162-1200) is
recommended with polyethylene windows. For window compatibility please
consult the Materials Properties table on page 125 of this catalog. For additional
window selections please see page 112.
608-274-2721
160-1126
162-1112
www.piketech.com
32 x 3 mm W indows for D emountable L iquid C ell
Pathlength (mm)
Pike Technologies
D emountable L iquid C ell H olders
Note: For more options, please contact PIKE Technologies.
95
Automated and Manual Technologies
Super-Sealed Liquid Cells –
For Precision, Fixed Pathlength Liquid Sampling
The PIKE Technologies Super-Sealed Liquid Cells are ideal for
quantitative analysis of liquid samples, especially where precise,
reproducible pathlength is required. They are designed to be leakproof for long-lasting sampling and cost efficiency.
The cells are amalgamated, further sealed with epoxy, and held
firmly within the standard 2” x 3” slide mount card compatible with
all FTIR spectrometers. Each Super-Sealed Liquid Cell includes LuerLok fittings for easy syringe filling of the sample. The clear aperture
of the assembled cell is 13 mm.
The PIKE Technologies Super-Sealed Cells are available in a
wide variety of window materials and sampling pathlengths.
Features
• Permanently mounted cell with fixed pathlength to
provide maximum reproducibility of sample absorbance
• Flexible window selection for optimizing spectral range
and sample compatibility
• Full range of cell pathlengths for optimized quantitative
measurements
• Compatible with all FTIR spectrometers
O r d e r i n g I n fo r m a t i o n
S uper -S ealed L iquid C ells – W indow O ptions
Path (mm)
0.0150.0250.050.10 0.15 0.200.50 1.0 5.010.0
Volume (mL)
0.005 0.0090.0180.036 0.054 0.072 0.18 0.36 1.80 3.60
BaF2
162-1640 162-1641162-1642162-1643 162-1649 162-1644162-1645 162-1646162-1647162-1648
CaF2
162-1630 162-1631162-1632162-1634 162-1635 162-1636162-1633 162-1637162-1638162-1639
CsI
162-1680 162-1681162-1682162-1683 162-1689 162-1684162-1685 162-1686162-1687162-1688
KBr
162-1620 162-1621162-1622162-1623 162-1624 162-1625162-1626 162-1627162-1628162-1629
KRS-5
162-1660 162-1661162-1662162-1663 162-1669 162-1664162-1665 162-1666162-1667162-1668
NaCl
162-1610 162-1611162-1612162-1613 162-1614 162-1615162-1616 162-1617162-1618162-1619
SiO2
162-1609 162-1601162-1602162-1603 162-1690 162-1604162-1605 162-1606162-1607162-1608
ZnSe
162-1650 162-1651162-1652162-1653 162-1659 162-1654162-1655 162-1656162-1657162-1658
ZnS
162-1670 162-1671162-1672162-1673 162-1679 162-1674162-1675 162-1676162-1677162-1678
Notes: Please select 2 syringes (below) for filling the Super-­­­Sealed Cell. All Super-Sealed Cells include Teflon® stoppers.
O ptions and R eplacement P arts
Part Number
Description
161-0520
Glass Syringe, 1 mL
161-0521
Glass Syringe, 2 mL
161-0522
Glass Syringe, 5 mL
162-1300
Teflon Stoppers (12 ea.)
Note: For other options please contact PIKE Technologies.
96
Long-Path Quartz Liquid Cells –
For Analysis of Hydrocarbon Content and Related Measurements
T ransmission
Spectrum of 10-mm Long-Path Quartz Cell.
Features
• For the analysis of hydrocarbon content of water, soil and
other environmental samples
• For analysis of polymer additives after extraction
• Highest quality quartz cells for clear infrared spectral
transmission and optimized result
Cell Pathlength (mm) Nominal Volume (mL)
Number of Stoppers
10
2.80
20
5.60
50
14.10
10028.20
1
2
2
2
All cylindrical cells have an outside diameter of 22 mm and an inside
diameter of 19 mm.
O r d e r i n g I n fo r m a t i o n
L ong -P ath Q uartz L iquid C ells
Part Number Description
162-1801
Long-Path Quartz Cell, 10 mm
162-1802
Long-Path Quartz Cell, 20 mm
162-1805
Long-Path Quartz Cell, 50 mm
162-1810
Long-Path Quartz Cell, 100 mm
Notes: Cells include Teflon stoppers. Select slide sample holder below.
Part Number Description
161-2530
Slide Sample Holder, Quartz Cell, 10–20 mm
161-2540
Slide Sample Holder, Quartz Cell, 50 mm
161-2550
Slide Sample Holder, Quartz Cell, 100 mm
Note: Please contact PIKE Technologies for replacement Teflon stoppers and items
not described on this list.
www.piketech.com
H olders for L ong -P ath Q uartz L iquid C ell
Pike Technologies
The PIKE Technologies Long-Path Quartz Liquid Cells are ideal for
the quantitative analysis of hydrocarbons in water and soil samples
or for the analysis of additive content in polymers after extraction.
Sample extracts are easily transferred to the quartz cells for
infrared analysis. Pathlengths ranging from 10 mm to 100 mm
are available for optimization of the sample absorbance. The
cells are manufactured of special grade IR quartz which is fully
transparent in the hydrocarbon absorbance region. The quartz
cells are compatible with organic and aqueous solvents and are
suitable for use with the D7066-04 ASTM method. A 2” x 3” slide
mount holder is available for the cells.
Specifications
608-274-2721
97
Automated and Manual Technologies
Falcon Mid-IR Transmission Accessory –
For Precise Temperature Control of Demountable Liquid Cells
Features
PIKE TempPRO software for kinetic experiments.
• Peltier temperature control from 5 to 130 °C
• Wide selection of windows for optimizing spectral range
and sample compatibility
Specifications
Temperature Control
• Flexible pathlength to control sample absorbance
• Demountable cell design for easy cleaning of
Temperature Range
• Available for most FTIR spectrometers
Temperature Controllers
difficult samples
The PIKE Technologies Falcon Mid-IR Transmission Accessory
is recommended for qualitative and quantitative analysis of
liquids and protein solutions where it is necessary to control the
temperature of the sample. Temperature range of the accessory is
5 to 130 °C with +/- 0.5% accuracy. Heating and cooling is controlled
by a built-in Peltier device providing for reproducible ramping and
for reaching target temperatures quickly and reliably. The system is
driven by a digital temperature controller – directly or via PC.
A wide variety of window types and spacer pathlengths are
available for this product. Window options cover NIR, mid-IR and
far-IR spectral regions and sample compositions from organic to
aqueous. A complete transmission cell for use with the Falcon Mid-IR
Accessory consists of two 32 mm x 3 mm size windows (drilled and
undrilled), an assorted spacer set, the needle plate with Luer-Lok
fittings, two gaskets and a proprietary cell mount.
The full Falcon configuration requires the accessory base with
cell holder, user selected windows, and one of the available
temperature controllers. The Falcon accessory is compatible with
most brands of FTIR spectrometers.
Peltier (cooling and heating)
5 to 130 °C
Accuracy
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Sensor Type
Digital +/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Input Voltage90–264 V, auto setting, external
power supply
Output Voltage
16 VDC/150 W max.
Dimensions (W x D x H)89 x 121 x 83 mm
(without FTIR baseplate and mount)
otes: Peltier device must be water cooled for proper operation – this is achieved
N
by running cold tap water through the water jacket integrated into the accessory
shell, or by the use of an external liquid circulator.
O r d e r i n g I n fo r m a t i o n
Part Number Description
111-40XX
Falcon Mid-IR Base with Cell Holder
Includes temperature-controlled base, demountable cell,
gaskets and one complete set of spacers. Select digital
temperature controller (below) and windows (next page)
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Please select 2 syringes (next page) for filling the demountable liquid cell.
T emperature C ontrollers (must select one)
Part Number Description
076-1230
Digital Temperature Control Module for Falcon Accessory
076-1430Digital Temperature Control Module, PC Control for
Falcon Accessory
Notes: Digital Temperature Control Module is required to control temperature.
PC version includes PIKE TempPRO software.
L iquid R ecirculator
Liquid
Recirculator
98
Part Number Description
170-1100
Liquid Recirculator
O r d e r i n g I n fo r m a t i o n
32 x 3 mm W indows
for F alcon D emountable L iquid C ells
D emountable L iquid C ell R eplacement P arts
Part Number Description
(must select minimum of 1 Plain and 1 Drilled)
Part Number
Plain
Drilled
160-1147
160-1146
Demountable Liquid Cell for the Falcon Mid-IR Accessory
Description
162-1300
Teflon Stoppers (12 ea.)
BaF2
162-1311
Viton Gasket, 32 mm (12 ea.)
CaF2
162-1310
Teflon Gasket, 32 mm (12 ea.)
160-1143
160-1142
160-1137
160-1136
Ge
161-0520
Glass Syringe, 1 mL
160-1132
160-1131
KBr
161-0521
Glass Syringe, 2 mL
160-1126
160-1125
KRS-5
161-0522
Glass Syringe, 5 mL
160-1122
160-1121
NaCl
160-1159
160-1158
Si
Note: For other options for the Demountable Liquid Cell, please contact
PIKE Technologies.
160-1113
160-1112
ZnSe
Notes: For window compatibility please consult the Materials Properties table on
page 125 of this catalog. For additional window selections please see page 111 of
this catalog.
T ransmission
162-1600
D emountable L iquid C ell S pacers (Optional)
Part Number
Pathlength (mm)
162-1210
0.015
162-1220
0.025
162-1230
0.050
162-1240 0.100
162-1250
0.200
162-1260
0.500
162-1270
1.000
162-1290
Assortment
Notes: Spacer packages above include 12 spacers. The assortment package includes 2
each of the different pathlengths.
Pike Technologies
www.piketech.com
608-274-2721
99
Automated and Manual Technologies
Falcon NIR Transmission Accessory – Quantitative and Qualitative
Analysis of Liquids under Precise Temperature Control
Specifications
Temperature Control
Temperature Range
Peltier (cooling and heating)
5 to 130 °C
Accuracy
+/- 0.5%
3 wire Pt RTD (low drift, high stability)
Sensor Type
Temperature Controllers
Digital
+/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Input Voltage90–264 V, auto setting, external
power supply
Features
• Fast, easy quantitative and qualitative analysis of samples
under precise Peltier temperature control
• Choice of cuvette and vial adapters
• Compatible with disposable 5-, 8- and 12-mm vials
• Excellent thermal accuracy and precision
• Available for most FTIR spectrometers
The PIKE Technologies Falcon NIR Transmission Accessory is an
excellent choice for quantitative and qualitative analysis of liquid
samples in the NIR spectral region. Temperature range of the
accessory is 5 to 130 °C with +/- 0.5% accuracy. Heating and cooling
is controlled by a built-in Peltier device. The Peltier element provides
for reproducible ramping and for reaching target temperatures
quickly and reliably. The system is driven by a Digital Temperature
Controller – directly or via PC.
Individual sample holders are designed to accommodate
standard 5-mm, 8-mm and 12-mm glass vials and 1-cm
cuvettes. Sample holders are pin-positioned to ensure maximum
reproducibility.
The complete Falcon NIR configuration requires the accessory
base, cell holder, and one of the available temperature controllers.
The Falcon accessory is compatible with most brands of FTIR
spectrometers.
Output Voltage
16 VDC/150 W max.
Dimensions (W x D x H)89 x 121 x 83 mm
(without FTIR baseplate and mount)
otes: Peltier device must be water-cooled for proper operation – this is achieved
N
by running cold tap water through the water jacket integrated into the accessory
shell, or by the use of an external liquid circulator.
O r d e r i n g I n fo r m a t i o n
Part Number Description
110-60XX
Falcon NIR Base
Includes temperature-controlled base. Digital Temperature
Controller and sample holder need to be selected from the
tables below for a complete system.
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
T emperature C ontrollers (must select one)
Part Number Description
076-1230
Digital Temperature Control Module
076-1430
Digital Temperature Control Module, PC Control
Notes: Digital Temperature Control Module is required to control temperature.
PC version includes PIKE TempPRO software.
S ample H olders (must select one or more)
Part Number Description
111-3610
Vial Holder, 5 mm
111-3620
Vial Holder, 8 mm
111-3630
Vial Holder, 12 mm
111-3640
Cuvette Holder, 1 cm
O ptions
Part Number Description
162-0205
Glass Vials, 5 mm (200 ea.)
162-0208 Glass Vials, 8 mm (200 ea.)
162-0212 Glass Vials, 12 mm (200 ea.)
162-0255 Falcon Quartz Cuvette, 1 cm
Note: Please see more cuvette options on page 140.
L iquid R ecirculator
Part Number Description
170-1100
100
NIR transmission spectra of cooking oils in 8-mm glass vials measured
at 32 °C with the Falcon NIR Transmission Accessory.
Liquid Recirculator
Cryostat190 – Ultra-Low Temperature Accessory for Liquid and
Solid Transmission Sampling
O r d e r i n g I n fo r m a t i o n
Part Number Description
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Requires pump for vacuum (sold separately, see below).
S ample H olders (must select one)
Part Number Description
162-4301
Cryostat190 Liquid Transmission holder
162-4302
Cryostat190 Solid Transmission holder
T ransmission
162-43XXCryostat190
Includes Cryostat, 10 L liquid nitrogen Dewar, diaphragm
pump for flow of the liquid nitrogen, temperature controller
with mass flow controller
W indows for C ryostat 190 (must select two)
Part Number Description
Features
• Temperature range is -190 to 150 °C
• Liquid and solids holders
• Cryostat cooling system with 10 L Dewar
• Fits most spectrometers
Note: Electrical transformer may be required.
Window, Polyethylene, 32 x 3 mm
Notes: For window compatibility please consult the Materials Properties table
on page 125 of this catalog. For additional window selections please see page 112.
W indows for C ryostat 190 L iquid H older (must select two)
Part Number Description
160-1133
Window, KBr, 25 x 4 mm
160-1114
Window, ZnSe, 25 x 4 mm
160-1312
Window, KRS-5, 25 x 4 mm
160-5214
Window, Polyethylene, 25 x 4 mm
S pacers for C ryostat 190 L iquid H older (optional)
Part Number Pathlength
162-1110
Spacer, 0.015 mm
162-1120
Spacer, 0.025 mm
162-1130
Spacer, 0.050 mm
162-1140
Spacer, 0.100 mm
162-1150
Spacer, 0.200 mm
162-1160
Spacer, 0.500 mm
162-1170
Spacer, 1.000 mm
162-1190
Spacer, assortment
O ptions
Part Number Description
162-4303
Rotary Pump for Vacuum Insulation
162-4304
O-Ring for Liquid Cell (2 ea.)
608-274-2721
Dimensions (W x D x H)130 x 130 x 287 mm
(excludes baseplate and fittings)
Weight
3 kg
Accessory Body
Stainless steel
Clear Aperture
20 mm
Cooling Method
Liquid nitrogen
Cooling Hold Time
10 hours
Temperature Accuracy+/- 1 °C (-190 °C to 150 °C)
+/- 0.5 °C (-190 °C to 150 °C)
Temperature Sensor
RTD (PT100 Ω)
Operating Voltage
100 VAC
Operational Conditions
Temperature Range
15–35 °C
Humidity Range
Below 90% RH
Pressure Range Ambient
Window, KRS-5, 32 x 3 mm
160-5216
www.piketech.com
Specifications
Window, KBr, 32 x 3 mm
160-1126
Pike Technologies
The Cryostat190 is a temperature controlled transmission accessory
for the spectroscopic analysis of liquids and solids. Using a liquid
nitrogen cryostat in combination with resistive heating the
accessory’s temperature range is -190 to 150 °C.
The temperature control system uses a mass flow controller
to precisely meter the liquid nitrogen flow to maintain steady subambient temperatures or to control temperature ramping with
accuracy. The 10 L Dewar provides cooling up to 10 hours, which is
convenient for extended time studies and experiments that require
long-term signal averaging.
Spectroscopic measurements at low temperatures may be
performed to refine the absorbance bands, which are generally
sharper and narrower, to reduce sample degradation and to
investigate unstable intermediates.
160-1132
Liquid nitrogen cooled system and temperature control module.
101
Automated and Manual Technologies
Heated Solid Transmission Accessory – Measurements of Optical
Components and Polymers
Two configurations are available, the standard and enclosed
model. The enclosed version offers a sealed environment around the
sample, making this an ideal accessory for glove box applications
and creating an inert or reacting gas blanket around the sample. The
accessory requires a liquid recirculator prevent overheating.
The temperature of the Heated Solid Transmission Accessory is
regulated by a digital temperature controller. PC interfaced and freestanding versions are available.
Enclosed
model
Specifications
Standard
model
Cell Body
2” x 3” Slide Mount
Temperature Range
Ambient to 300 °C
Sample Thickness
Dimensions (W x D x H)
Features
• Quick sample loading and unloading
• Selection of different size sample holders
• Wide temperature range – from ambient to 300 °C
• Environmentally enclosed configuration
Aluminum
Mount
3 mm max.
77 x 51 x 93 mm
Cooling Requirements
Coolant Temp
Coolant Pressure
Coolant Flow Rate
6 to 28 °C
0.1–2 kgf/cm 2
20–1000 mL/min
Temperature Controllers
Digital
The Heated Solid Transmission Accessory is designed to analyze
solid samples at temperatures ranging from ambient to 300 °C. It
supports a set of optional sample mounts able to hold samples from
12 mm to 30 mm in diameter and up to 3-mm thick. Sample loading
is simple and does not require any tools. The accessory is equipped
with a standard 2” x 3” slide that makes it easy to mount in all types
of spectrometers and most spectrophotometers. The heating time
from ambient temperature to 300 °C is 30 minutes.
Input Voltage
+/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Output Voltage
Controller Dimensions (W x D x H)
90–264 auto-setting
external power supply
6A/24 VAC max.
140 x 200 x 60 mm
O r d e r i n g I n fo r m a t i o n
Part Number Description
112-1000
Heated Solid Transmission Accessory, standard
112-1100
Heated Solid Transmission Accessory, enclosed
Note: Select at least one sample holder, which is specific to the configuration
of the accessory – standard or enclosed.
T emperature C ontrollers (must select one or more)
Part Number Description
076-1410
Temperature Controller – PC Control
076-1210
Temperature Controller
Note: PC version includes PIKE TempPRO software.
S ample H olders (must choose at least one)
Part Number Description
L iquid R ecirculator
112-2010
12–15 mm Diameter Sample Holder, standard
Part Number Description
112-2020
16–20 mm Diameter Sample Holder, standard
170-1100
112-2030
21–25 mm Diameter Sample Holder, standard
112-2040
26–30 mm Diameter Sample Holder, standard
112-2110
12–15 mm Diameter Sample Holder, enclosed
112-2120
16–20 mm Diameter Sample Holder, enclosed
112-2130
21–25 mm Diameter Sample Holder, enclosed
Liquid Recirculator
25 x 2 mm W indows (must select two or more for enclosed model only)
Part Number Description
Part Number Description
160-1306
BaF2
160-5086SiO2
160-1212
CaF2
160-5122SiO2, Low OH
160-1305KBr
160-5213
160-1155 ZnSe
Polyethylene
Note: Please see more window options on page 112.
102
Bolt Press & Hydraulic Die – Low-Cost Pellet Preparation
O r d e r i n g I n fo r m a t i o n
P ellet P ress
Part Number Description
Bolt Press for 13-mm pellets
161-3500
Hydraulic Die for 13-mm pellets
Notes: The Bolt Press includes evacuable barrel, 2 anvil bolts, 2 15/16” wrenches,
and Bolt Press Holder. The Hydraulic Die includes evacuable barrel, 2 rams and
Hydraulic Die Holder. The maximum force limit 5 ton.
The PIKE Technologies Bolt Press and Hydraulic Die are low-cost
tools for making KBr pellets for transmission FTIR analysis.
The press and die consist of a stainless steel barrel with two
hardened and polished 13-mm rams. The barrels are equipped
with a fitting which allows evacuation of air while the pellet is
formed. For the Bolt Press, the pressure is applied to the sample
by tightening the bolts against each other with standard 15/16”
wrenches – included. For the Hydraulic Die the pressure is
applied to the sample by placing it in a hydraulic press – up to
10,000 psi. Once a clear pellet is formed, the rams are removed
and the sample is analyzed while still in the barrel (barrel is placed
directly in the beam using the Press Holder with a standard
2” x 3” slide mount). Both accessories form a 13-mm pellet.
The PIKE Technologies Bolt Press and Hydraulic Die both
include a holder.
O ptions and R eplacement P arts
Part Number Description
160-8010
KBr Powder, 100 g
161-5050
Agate Mortar and Pestle, 50 mm
161-2511
Wrench Set for Bolt Press (2 ea.)
161-2520
Holder for Bold Press
161-2513
Barrel for Bolt Press
161-2525
Anvils for Bolt Press
161-3502
Anvils for Hydraulic Die
T ransmission
161-2500
Note: For more pellet press options, please contact PIKE Technologies.
Hand Press – For Making Smaller Pellets
Part Number Description
161-1100
Hand Press for 7-mm, 3-mm, and 1-mm pellets
Includes 7-mm, 3-mm, and 1-mm die sets, anvils, die
collars, anvil ejectors and Dual Pellet Holder
O ptions and R eplacement P arts
Part Number Description
161-5700
Dual Pellet Holder for 7-mm, 3-mm, and 1-mm pellets
161-1018
Single Pellet Holder for 7-mm pellets
160-8010
KBr Powder, 100 g
161-5050
Agate Mortar and Pestle, 50 mm
161-1027
Hand Press Body
161-1028
Die Set, 1-mm
161-1024
Die Set, 3-mm
161-1010
Die Set, 7-mm
161-1019
Die Set, 1-, 3- and 7-mm
www.piketech.com
Note: For more Hand Press options, please contact PIKE Technologies.
608-274-2721
The PIKE Technologies Hand Press is an ideal solution for laboratories that require only occasional preparation of KBr pellets and
cannot justify the expense of a hydraulic press.
The Hand Press is an efficient, reliable and inexpensive tool
which simplifies making small pellets. It consists of a long stainless
steel barrel and movable stage controlled by a lever capable of
applying high pressure to the KBr/powder mixture. The Hand
Press comes complete with three standard die sets (7, 3 and 1 mm).
The pellet preparation involves loading of the powdered sample
into the die chamber, placement of the upper anvil in the press and
application of hand pressure to the lever (this is sufficient to provide
clear, high-quality KBr disks). The Die Collar with the formed pellet
is removed from the press and in most cases it can be placed
directly in the beam of the spectrometer for analysis. The Hand
Press is equipped with a platen position dial for adjustment of
the force applied to the die for reproducible sample preparation.
Pike Technologies
O r d e r i n g I n fo r m a t i o n
103
Automated and Manual Technologies
Evacuable Pellet Press –
For Preparation of High Quality Pellets
Pellet preparation involves placement of the anvil in the die
chamber and covering it with the pre-measured amount of
KBr/sample mix. The second anvil is placed on the sample and
the plunger is inserted into the chamber. The entire assembly is
placed in a hydraulic press and compressed (a vacuum line can be
connected to the base to remove air from the sample). For analysis,
the formed pellet is ejected from the die with an extractor and
mounted onto a standard 2” x 3” sample holder.
Piston
Anvils
Die Body
Features
• Ideal for making high-quality KBr pellets
• Apply up to 20,000 lbs (9,071 kg) of pressure
• Evacuable to prevent cloudy pellets
• Requires hydraulic press
The PIKE Technologies Evacuable Pellet Press is the preferred
accessory for making pellets for FTIR analysis. Preparation of KBr
pellets with a 13-mm die and a hydraulic press is the most popular
method used to make samples for transmission measurements. It
is also required by a number of standardized procedures, including
some USLP and ASTM methods. Advantages of this approach include
the generation of high-quality pellets, reproducibility, and the ability
to deal with relatively difficult samples.
The PIKE Evacuable Pellet Press Kit features the following
components: a stainless steel base with vacuum outlet, the main die
block with a 13-mm cylinder, two polished anvils and a plunger. All
components are made of hardened stainless steel and surfaces that
come in contact with the sample are highly polished. Two O-rings
are used to seal the base/die assembly and the plunger.
O-Ring
Base
Vacuum
Evacuable pellet press assembly.
O r d e r i n g I n fo r m a t i o n
Part Number Description
161-1900
Evacuable Pellet Press for 13-mm pellets
Includes die block, anvils and pellet extracting tool
O ptions and R eplacement P arts
Part Number Description
160-8010
KBr Powder, 100 g
161-5050
Agate Mortar and Pestle, 50 mm
162-5300
Magnetic Film Holder for 13-mm pellets and film samples
162-5410
Sample Card for 13-mm pellets (10 ea.)
161-1908
Pellet Extracting Tool
161-1903
Anvils for PIKE Evacuable Pellet Press (2 ea.)
161-1902
Pellet Die Piston
161-1906
Piston O-Rings (2 ea.)
161-1907
Base O-Rings (2 ea.)
430-1110 Vacuum Pump, 110V
430-1220 Vacuum Pump, 220V
161-1070
ShakIR, Heavy Duty Sample Grinder, 110/220V
Includes mount for 1” vials
161-1035
ShakIR Stainless Steel Vial with Ball, 1” long x 0.5”+
Notes: ShakIR requires stainless steel vial and ball P/N 161-1035. For more Evacuable
Pellet Press options, please contact PIKE Technologies.
104
Pixie –
Manual Hydraulic Pellet Press
7-mm Die Set and
Pellet Holder
Specifications
Features
• 7-mm diameter die
• Applied force up to 2.5 tons
• Integrated force gauge
• Easy-to-use, ergonomic design
• Small footprint
Metric
English
Ram Force, max
2.3 metric tons
2.5 tons
Platen Diameter
20.2 mm 0.8”
Die Height Range
22–39 mm
0.86–1.54”
Maximum Die Width
79 mm
3.11”
Mass
4.5 kg
10 lbs
Dimensions (W x D x H)
Metric
English
127 x 192 x 201 (min.) mm
5.0 x 7.8 x 7.9 (min.)”
O r d e r i n g I n fo r m a t i o n
Part Number Description
181-1410
Pixie Hydraulic Press Package
Includes Pixie Hydraulic Press, 7-mm die set with two
additional die collars, pellet holder, 35-mm agate mortar,
KBr (50 g) and spoon spatula
181-1400
Pixie Hydraulic Press
O ptions and R eplacement P arts
Part Number Description
7-mm Die Set
161-1018
Single Pellet Holder for 7-mm pellets
161-1011 7-mm Collar
161-8010 KBr Powder, 100 g
161-5035
Agate Mortar and Pestle, 35 mm
042-3035
Spatula, spoon style
042-3050
Spatula, flat style
608-274-2721
161-1010
www.piketech.com
Spectrum of calciumoxalate hydrate; KBr pellet made with Pixie press.
Pike Technologies
PIKE Technologies introduces Pixie, a portable hydraulic press
for making high-quality KBr pellets. With the press’ ergonomic
design, pellet making is easy and effortless. Pixie’s small footprint
makes it ideal for limited bench-space environments and glove boxes,
and for storability. KBr pellets for IR transmission measurements are
required by a number of standardized procedures, including some
USLP and ASTM methods. Advantages of pellet making are spectral
reproducibility and the ability to deal with relatively difficult or
limited-mass samples.
The pellet preparation involves loading of the powdered KBr/
sample matrix into the die chamber and placing the assembled die
onto the platform of the hydraulic press. Force up to 2.5 tons may be
applied. The die collar containing the newly formed pellet is placed
into the designated holder and is positioned in the spectrometer’s
2 x 3” slide mount holder for measurement.
T ransmission
The comprehensive Pixie Package provides all necessary
components to start making pellets in the lab. It includes a 7-mm
die, two extra pellet collars, pellet holder, pestle and mortar set,
KBr powder and spatula. All die components are made of hardened
stainless steel and the parallel surfaces that come in contact with
the sample are highly polished for obtaining optimal pellet quality.
105
Automated and Manual Technologies
CrushIR –
Digital Hydraulic Press
FTIR spectrum of caffeine in KBr pellet made using the PIKE CrushIR
Hydraulic Press and Evacuable Pellet Press
Specifications
Features
• Up to 15 tons of force
• Digital force readout for exceptional reproducibility
• Adjustable maximum force
• Small footprint
• Transparent safety shield
Metric
English
Clamp Force, max
13.6 metric tons
15 US tons
Platen Diameter
100 mm
3.94”
Ram Stroke
5 mm
0.2”
Die Height Range
5–11.5 cm
2–4”
Dimensions (W x D x H)
31 x 25 x 35 cm
12 x 9.8 x 13.5”
Mass
23.6 kg
52 lbs
Input Voltage90–264 V, auto setting,
external power supply
Output Voltage9 VDC/18 W
O r d e r i n g I n fo r m a t i o n
PIKE Technologies offers an advanced hydraulic press for making
excellent-quality KBr pellets and thin films for transmission FTIR
analysis. With its integrated digital force reading, the CrushIR™
provides exceptional reproducibility.
The PIKE CrushIR features a small footprint and includes a
transparent protective shield, making it safe for operation in a busy
laboratory environment. Access for vacuum hose and other utilities
is made through a port in the rear of the press.
The adjustable top screw provides flexibility for die designs of
short and longer dimensions yielding an open stand range from
2” to 4” (5 to 11.5 cm). The efficient sized ram stroke of 0.2”
(5 mm) and adjustment screw speeds pellet making by minimizing
the time required to achieve the desired force. All mechanical
components of the press are enclosed in a safety metal cabinet.
The PIKE Evacuable Pellet Press and 13-mm pellet holder are
an excellent addition to the PIKE CrushIR. A packaged version of
these 3 products is available.
H ydraulic P ress (select one)
Part Number Description
181-1100
PIKE CrushIR Hydraulic Press
181-1110PIKE CrushIR Hydraulic Press, Evacuable Pellet Press
and Magnetic Holder
181-1120 PIKE CrushIR Heated Platens Package
Includes CrushIR, Heated Platens and Digital
Temperature Control Module
Note: The PIKE CrushIR Hydraulic Press includes an integrated safety shield.
O ptions and R eplacement P arts
Part Number Description
161-1900
Evacuable Pellet Press for 13-mm pellets
160-8010
KBr Powder, 100 g
161-5050
Agate Mortar and Pestle, 50 mm
162-5300
Magnetic Film Holder for 13-mm pellets
162-5410
Sample Card for 13-mm pellets (10 ea.)
430-1110 Vacuum Pump, 110V
430-1220 Vacuum Pump, 220V
161-1070
ShakIR, Heavy Duty Sample Grinder, 110/220V
161-1035
Stainless Steel Vial with Ball for ShakIR
Notes: ShakIR requires stainless steel vial and ball P/N 161-1035. For more Evacuable
Pellet Press options, please contact PIKE Technologies.
106
Heated Platens Accessory – For Making Thin Films of Polymeric
Samples for Transmission FTIR Analysis
Specifications
Features
• Fast, efficient means of making thin films for transmission
spectroscopy
• Temperature range – ambient to 300 ºC
• Standard stainless steel spacer set (15, 25, 50, 100, 250 and
500 microns all with 25-mm ID) included with accessory
• Integral design for easy insertion and removal of heated
platens into the hydraulic press
• Included insulating disks to minimize heat loss during
film pressing
• Standard cooling chamber included
Composition
Stainless steel platens, mirrored surfaces
Temperature Range Ambient to 300 ºC
Temperature Stability Insulated, < 3 ºC loss at 125 ºC set point during press of film
Input Voltage100–240 VAC, auto setting, external
power supply
Operating Voltage 24 VDC/100 W
Sensor Type 3 wire Pt RTD (low drift, high stability)
Heating Time Ambient to 100 ºC, less than 7 minutes
Cooling ChamberStandard, convection via liquid
circulation (not supplied)
Pressing Height 3.3 cm
Spacer Thickness 15, 25, 50, 100, 250 and 500 microns
Spacer ID 25 mm
Dimensions (W x D x H) 64 x 264 x 52 mm
Maximum Force 6 US tons
O r d e r i n g I n fo r m a t i o n
Part Number Description
181-2000
PIKE Heated Platens Accessory
181-1120 PIKE CrushIR Heated Platens Package
Includes CrushIR hydraulic press, Heated Platens and digital
temperature control module
Notes: The Heated Platens Accessory includes spacer set, thermal insulating disks,
cooling chamber, aluminum disks and magnetic film holder. P/N 181-2000 requires
selection of temperature controller below.
T emperature C ontroller for H eated P latens (must select)
Part Number Description
076-1220
Digital Temperature Control Module
O ptions and R eplacement P arts
Part Number Description
Spacer Set, 15, 25, 50, 100, 250, 500 microns
181-3020
Aluminum Disks (50 ea.)
181-3010
Spacer, 15 micron
181-3011
Spacer, 25 micron
181-3012
Spacer, 50 micron
181-3013
Spacer, 100 micron
181-3014
Spacer, 250 micron
181-3015
Spacer, 500 micron
162-5300
Magnetic Film Holder for 13-mm pellets and film samples
162-5410
Sample Card for 13-mm pellets (10 ea.)
Note: See page 110 for more film holder options.
608-274-2721
181-3000
www.piketech.com
Note: The digital temperature controller is required for operation of the Heated
Platens Accessory.
Transmission spectrum of thin film of high-density polyethylene produced
from PIKE Heated Platens Accessory.
Pike Technologies
The PIKE Heated Platens Accessory is designed to efficiently
make thin films of polymer materials for infrared transmission
spectroscopy. IR transmission spectra of thin films, which are made
from polymer pellets or other plastic sample forms, offer more
sensitivity than typical ATR spectra. Polymer films are ideal for
investigating polymer additives.
Typically a 2–5 milligram portion of polymer is cut from the
pellet or other plastic sample and placed between aluminum
disks within the heated base of the platens. The temperature of
the platens is chosen to match the melting point of the polymer
material. The top plate of the heated platens accessory is placed
over the assembly and the unit is inserted into the hydraulic press.
A low force (2 tons) is generally applied to the sample in the heated
platens accessory to make excellent films.
The PIKE Heated Platens Accessory includes insulating disks
to maintain the desired temperature at the sample’s melting point
when making thin polymer films. These insulating disks improve
T ransmission
the quality of thin films by making them more IR transmissive.
Flattening the polymer below its melting point produces cloudy film.
Pressing the polymer film when it is above it’s melting point may
cause polymer degradation.
The PIKE Heated Platens Accessory is compatible with the PIKE
CrushIR™ Hydraulic Press and other hydraulic presses (please inquire).
107
Automated and Manual Technologies
ShakIR and Super ShakIR –
For Optimized Sample Grinding
Standard ShakIR
ShakIR accessories provide a fast and simple method of mixing
and grinding samples for diffuse reflectance sampling and in
preparation for making KBr pellets. A small amount of sample
or the IR transparent diluent (typically KBr) is simply scooped into a
vial with mixing ball. The accessory thoroughly mixes and pulverizes
the contents within seconds.
The standard ShakIR uses reciprocating motion of the vial
holder that follows a “figure 8” path. The vial is swung through a
5 degree arc at high RPMs causing the ball to strike the end of
the vial, which is sufficient to grind most materials into a powder.
The accessory provides electronic control for precise and
reproducible setting of grinding time up to 95 seconds. The
protective shield provides security to grinder operation. The
ShakIR construction and weight offer long-term, reliable operation
and minimized vibration and noise. The ShakIR features a small
footprint. The base is 15 cm x 18 cm with a height of 28 cm.
The Super ShakIR also uses “figure 8” reciprocating motion
for sample grinding, plus it offers more control over grinding
speed and time intervals – specifically, 6 RPM levels from 2500 to
4600 are available and samples can be ground from 5 to 60 seconds.
This provides a wide range of settings for bringing even very
difficult samples to fine powder consistency quickly.
The Super ShakIR features a heavy-duty metal body with a
chemically-resistant stainless steel grinding chamber. The unit
operates quietly, regardless of RPM settings. The grinding chamber
is protected by the door with a viewing window. For safety, the
accessory will not operate until the door is fully closed. The Super
ShakIR footprint is 18 cm x 28 cm and its height is 16 cm.
O r d e r i n g I n fo r m a t i o n
S hak IR
Part Number Description
Super ShakIR
Features
• Produce finely powdered mix of sample and diluent –
ideal for clear pellets and excellent diffuse reflectance
spectra
• Minimize exposure of sample to atmospheric moisture –
a chief cause of cloudy pellets
• Options for grinding ordinary and difficult samples
• Built-in safety features
161-1070
ShakIR, Heavy Duty Sample Grinder, 110/220V
Includes mount for 1” vials
S hak IR V ials (required)
Part Number Description
161-1035
Stainless Steel Vial with Ball, 1” long x 0.5”
O ptions and R eplacement P arts for S hak IR
Part Number Description
161-1037
Spare Stainless Steel Ball
160-8010
KBr Powder, 100 g
S uper S hak IR
Part Number Description
161-1080
Super ShakIR, Sample Grinder, 110/220V
Includes mount for 1.7” vials with 2 end-cups, a stainless
steel vial, 50 stainless steel balls and a bullet-shaped bead
O ptions and R eplacement P arts for S uper S hak IR
Part Number Description
108
161-1038 Bullet-Shaped Bead
161-1039
Stainless Steel Vial, 1.7”­­long
161-1041
Stainless Steel Balls, assorted sizes (50 pieces)
161-1036
Polymer Vials (20 ea.)
Sample Preparation Accessories –
For Solid Material Analysis (powders, mull agents, grinding tools and more)
O r d e r i n g I n fo r m a t i o n
IR T ransparent P owders
Part Number Description
160-8010
Features
• Accessories for analysis of solids by transmission
and diffuse reflectance
• Materials for pellets and mulls
KBr Powder, 100 g
IR T ransparent C hunks
T ransmission
Preparation of samples for FTIR analysis by diffuse reflection or
transmission analysis requires a number of tools and accessories
for convenient and high quality results. PIKE Technologies has
assembled these tools to make your FTIR sampling easier.
IR transparent powders and chunks, mulling agents and manual
sample grinding tools with a complete selection of agate mortars and
pestles are in stock and ready for immediate delivery.
Part Number Description
160-8015
KBr Chunks, 100 g
A gate M ortar and P estles
Part Number Description
161-5035
Agate Mortar and Pestle, 35 mm
161-5040
Agate Mortar and Pestle, 40 mm
161-5050
Agate Mortar and Pestle, 50 mm
161-5065
Agate Mortar and Pestle, 65 mm
161-5095
Agate Mortar and Pestle, 95 mm
161-5100
Agate Mortar and Pestle, 100 mm
Note: The 50-mm Agate Mortar and Pestle is our most popular size and
recommended for most applications.
Part Number Description
042-3035
Spatula – spoon
042-3050
Spatula – flat
M ulling A gents
Part Number Description
161-0500
Nujol
161-0510
Fluorolube
www.piketech.com
Note: For more sample preparation tool options contact PIKE Technologies.
Pike Technologies
S patulas for S olids and M ulls
608-274-2721
109
Automated and Manual Technologies
Sample Holders –
For Transmission FTIR Analysis of Pellets and Films
All PIKE Technologies transmission holders are constructed of
high-quality materials and feature a 2” x 3” standard slide mount
compatible with all FTIR spectrometers.
Universal Sample Holder
Heavy-Duty Magnetic Film Holder
Magnetic Film/Pellet Holder
Press-On Demountable Cell Holders
The Universal Sample Holders feature a spring-loaded
mechanism which conveniently keeps in place films, salt plates,
KBr pellets and other materials. The clear aperture of the holders
is 20 mm and 10 mm. This universal holder offers great sample
mounting flexibility.
Heavy-Duty Magnetic Film Holder is designed to hold thick
polymer materials and other transmission samples. The holder
features a large size magnet and steel plate with a 20-mm aperture.
The Magnetic Film/Pellet Holder is used to mount KBr
pellets and thin polymer films. Its components include a steel plate
and flexible magnetic strip. The holder is designed to support
13-mm KBr pellets and films less than 0.5-mm thick.
Press-On Demountable Cell Holders are used for the analysis
of smears and mulls. Available in 25-mm and 38-mm versions,
both include mounting plate and pressure cap. Windows and spacers
must be ordered separately.
The Single Pellet Holder for 7-mm KBr pellets is designed
for use with the PIKE Technologies Hand Press and Pixie Hydraulic
Press. For making only 7-mm pellets, this version is more convenient
than the Dual Pellet Holder.
A Dual Pellet Holder for 1-, 3- and 7-mm KBr pellet collars
features semi-circular mounts with slots accommodating specified
size pellets as made using the PIKE Technologies Hand Press.
The PIKE Technologies Sampling Cards are inexpensive sample
holders for analysis of films, polymers, 13-mm KBr pellets and
other materials. Self-adhesive treated sides make sample preparation
easy. The cards also offer compact and convenient means of
sample storage.
Bolt Press and Gas Cell Holders – three different sizes are
available. Each holder has detachable support rods for different
sized accessories. The holders can also be used for placing salt
plates and other large samples.
O r d e r i n g I n fo r m a t i o n
Part Number Description
Single Pellet Holder
Dual Pellet Holder
162-5600 Universal Sample Holder, 20-mm aperture*
162-5610
Universal Sample Holder, 10-mm aperture*
162-5500 Heavy-Duty Magnetic Film Holder
162-5300 Magnetic Film Holder for 13-mm pellets and film samples
162-3600
Press-On Demountable Cell Holders for 25-mm windows
162-3610
Press-On Demountable Cell Holders for 32-mm windows
161-1018 Single Pellet Holder
161-5700 Dual Pellet Holder*
162-5410
Sample Card for 13-mm pellets (10 ea.)*
162-5400
Film Sampling Card, 20-mm aperture (10 ea.)*
161-2520
Bolt Press Holder
162-2105 Gas Cell Holder, 25 mm x 50 or 100 mm
162-2205 Gas Cell Holder, 38 mm x 50 or 100 mm
Notes: For more sample holder options, please contact PIKE Technologies. Holders
marked “*” fit all standard 2” x 3” slide mounts, but due to their height may
not allow for a complete sample compartment door closure on some smaller
spectrometers. Please consult PIKE Technologies before placing an order.
R eplacement P arts
Part Number Description
Sampling Cards
110
Bolt Press and Gas Cell Holders
162-5611
O-Rings for Universal Sample Holder, 25 mm (6 ea.)
162-5612
O-Rings for Universal Sample Holder, 10 mm (6 ea.)
Disks, Windows and Powders –
For Transmission FTIR Analysis of Solid and Liquid Samples
Note: Save on price and shipping cost by selecting 6-pack versions
of popular crystals.
O r d e r i n g I n fo r m a t i o n
Powders
Part Number
Description
160-8010
KBr Powder, 100 g
Chunks
Disks, 13 mm Diameter
Disks, 20 mm Diameter
1 mm T hickness 2 mm T hickness
Part Number
Description
Part Number
Description
160-5003
KBr, 13 x 1 mm
160-1148
BaF2, 20 x 2 mm
160-5004
NaCl, 13 x 1 mm
160-1144
CaF2, 20 x 2 mm
Part Number
Description
160-1149
BaF2, 13 x 1 mm
160-1197
CsI, 20 x 2 mm
160-8015
KBr Chunks, 100 g
160-5001
CaF2, 13 x 1 mm
160-1139
Ge, 20 x 2 mm
160-1134
KBr, 20 x 2 mm
160-1128
KRS-5, 20 x 2 mm
160-1169
NaCl, 20 x 2 mm
160-5211
Polyethylene, 20 x 2 mm
160-5119
SiO2, 20 x 2 mm
2 mm T hickness
AMTIR, 13 x 2 mm
160-1218
BaF2, 13 x 2 mm
160-1213
CaF2, 13 x 2 mm
160-1198
CsI, 13 x 2 mm
160-1191
Ge, 13 x 2 mm
160-1135
KBr, 13 x 2 mm
160-1008
KBr, 13 x 2 mm (6-pack)
160-1173
KRS-5, 13 x 2 mm
160-1170
NaCl, 13 x 2 mm
160-1005
NaCl, 13 x 2 mm (6-pack)
2 mm T hickness
160-5201
SiO2, 13 x 2 mm
Part Number
Description
160-5120
SiO2, low OH, 13 x 2 mm
160-1201
AMTIR, 25 x 2 mm
160-1160
Si, 13 x 2 mm
160-1306
BaF2, 25 x 2 mm
160-1241
ZnS, 13 x 2 mm
160-1212
CaF2, 25 x 2 mm
ZnSe, 13 x 2 mm
160-1002
CaF2, 25 x 2 mm (6-pack)
ZnSe, 13 x 2 mm (6-pack)
160-1308
CsI, 25 x 2 mm
160-1307
Ge, 25 x 2 mm
160-1305
KBr, 25 x 2 mm
160-1172
KRS-5, 25 x 2 mm
160-1168
NaCl, 25 x 2 mm
160-1004
NaCl, 25 x 2 mm (6-pack)
160-5213
Polyethylene, 25 x 2 mm
160-5086
SiO2, 25 x 2 mm
160-5122
SiO2, low OH, 25 x 2 mm
160-1117
Si, 25 x 2 mm
160-5084
ZnS, 25 x 2 mm
160-1155
ZnSe, 25 x 2 mm
160-1007
ZnSe, 25 x 2 mm (6-pack)
160-1115
160-1001
160-5121
SiO2, low OH, 20 x 2 mm
160-1118
Si, 20 x 2 mm
160-5118
ZnS, 20 x 2 mm
160-1304
ZnSe, 20 x 2 mm
Disks, 25 mm Diameter
608-274-2721
160-1301
www.piketech.com
Description
Pike Technologies
Part Number
T ransmission
PIKE Technologies offers premier stock window and crystal
materials – a carefully selected range of IR transparent materials
most often used by IR spectroscopists. They fit PIKE accessories
and cell holders available from other vendors. All windows,
crystals and powders are made from the best quality material.
The optical components are individually packaged and silica gel
is included with those materials which are affected by humidity.
Products highlighted in red are in stock and available for immediate
delivery. Please refer to the next pages for full range of IR optical
materials, windows and crystals.
111
Automated and Manual Technologies
O r d e r i n g I n fo r m a t i o n
Disks, 25 mm Diameter
Disks, 32 mm Diameter
Disks, 37.5 mm Diameter
4 mm T hickness
3 mm T hickness
4 mm T hickness
Part Number
Description
Part Number
Description
Part Number
Description
160-1217
BaF2, 25 x 4 mm
160-1200
AMTIR, 32 x 3 mm
160-1281
BaF2, 37.5 x 4 mm
160-1211
CaF2, 25 x 4 mm
160-1199
AMTIR, drilled, 32 x 3 mm
160-1196
CsI, 25 x 4 mm
160-1147
BaF2, 32 x 3 mm
160-1286
ZnSe, 1-side AR coated,
37.5 x 4 mm
160-1138
Ge, 25 x 4 mm
160-1017
BaF2, 32 x 3 mm (6-pack)
160-1287
CaF2, 37.5 x 4 mm
160-1288
KBr, 37.5 x 4 mm
160-1289
KCl, 37.5 x 4 mm
160-1290
NaCl, 37.5 x 4 mm
160-1291
ZnSe, 37.5 x 4 mm
160-1133
KBr, 25 x 4 mm
160-1146
BaF2, drilled, 32 x 3 mm
160-1009
KBr, 25 x 4 mm (6-pack)
160-1018
BaF2, drilled, 32 x 3 mm (6-pack)
160-1127
KRS-5, 25 x 4 mm
160-1143
CaF2, 32 x 3 mm
160-1124
NaCl, 25 x 4 mm
160-1142
CaF2, drilled, 32 x 3 mm
160-1012
NaCl, 25 x 4 mm (6-pack)
160-1195
CsI, 32 x 3 mm
160-5214
Polyethylene, 25 x 4 mm
160-1194
CsI, drilled, 32 x 3 mm
160-5089
SiO2, 25 x 4 mm
160-1137
Ge, 32 x 3 mm
160-5123
SiO2, low OH, 25 x 4 mm
160-1136
Ge, drilled, 32 x 3 mm
160-1116
Si, 25 x 4 mm
160-1132
KBr, 32 x 3 mm
160-5087
ZnS, 25 x 4 mm
160-1010
KBr, 32 x 3 mm (6-pack)
160-1114
ZnSe, 25 x 4 mm
160-1131
KBr, drilled, 32 x 3 mm
160-1015
KBr, drilled, 32 x 3 mm (6-pack)
160-1126
KRS-5, 32 x 3 mm
160-1110ZnSe, single AR coated,
25 x 4 mm
160-1125
KRS-5, drilled, 32 x 3 mm
160-1122
NaCl, 32 x 3 mm
5 mm T hickness
160-1013
NaCl, 32 x 3 mm (6-pack)
Part Number
Description
160-1121
NaCl, drilled, 32 x 3 mm
160-1311
BaF2, 25 x 5 mm
160-1014
NaCl, drilled, 32 x 3 mm (6-pack)
160-1210
CaF2, 25 x 5 mm
160-5216
Polyethylene, 32 x 3 mm
160-1316
CsI, 25 x 5 mm
160-5215
Polyethylene, drilled, 32 x 3 mm
6 mm T hickness
160-1313
Ge, 25 x 5 mm
160-5049
SiO2, 32 x 3 mm
Part Number
Description
160-1357
AMTIR, 38 x 6 mm
160-1109ZnSe , double AR coated,
25 x 4 mm
Disks, 38 mm Diameter
3 mm T hickness
Part Number
Description
160-1349
BaF2, 38 x 3 mm
160-1350
Ge, 38 x 3 mm
160-5220
KBr, 38 x 3 mm
160-1344
KRS-5, 38 x 3 mm
160-5218
Polyethylene, 38 x 3 mm
160-1233
SiO2, 38 x 3 mm
160-5127
SiO2, low OH, 38 x 3 mm
160-1353
Si, 38 x 3 mm
160-1315
ZnS, 38 x 3 mm
160-5025
ZnSe, 38 x 3 mm
160-1189
KBr, 25 x 5 mm
160-5125
SiO2, low OH, 32 x 3 mm
160-1003
KBr, 25 x 5 mm (6-pack)
160-5052
SiO2, drilled, 32 x 3 mm
160-1322
BaF2, 38 x 6 mm
160-1312
KRS-5, 25 x 5 mm
160-5126
SiO2, drilled, low OH, 32 x 3 mm
160-1342
CaF2, 38 x 6 mm
160-1123
NaCl, 25 x 5 mm
160-1159
Si, 32 x 3 mm
160-1326
CsI, 38 x 6 mm
160-1011
NaCl, 25 x 5 mm (6-pack)
Si, drilled, 32 x 3 mm
160-1323
Ge, 38 x 6 mm
KBr, 38 x 6 mm
160-1158
160-5100
SiO2, 25 x 5 mm
160-5047
ZnS, 32 x 3 mm
160-1320
160-5124
SiO2, low OH, 25 x 5 mm
160-5048
ZnS, drilled, 32 x 3 mm
160-1343
KRS-5, 38 x 6 mm
160-5090
ZnS, 25 x 5 mm
ZnSe, 32 x 3 mm
160-1321
NaCl, 38 x 6 mm
ZnSe, drilled, 32 x 3 mm
160-5219
Polyethylene, 38 x 6 mm
160-1154
ZnSe, 25 x 5 mm
160-1113
160-1112
160-1355
SiO2, 38 x 6 mm
160-5128
SiO2, low OH, 38 x 6 mm
160-1324
Si, 38 x 6 mm
160-1329
ZnSe, 38 x 6 mm
Note: Products highlighted in red are in stock and
available for immediate delivery.
112
O r d e r i n g I n fo r m a t i o n
Windows, 29 mm x 14 mm
3 mm T hickness
4 mm T hickness
Part Number
Description
Part Number
Description
160-1216
BaF2, 41 x 3 mm
160-1215
BaF2, 29 x 14 x 4 mm
160-1209
CaF2, 41 x 3 mm
160-5010
BaF2, drilled, 29 x 14 x 4 mm
160-1188
KBr, 41 x 3 mm
160-1207
CaF2, 29 x 14 x 4 mm
160-1167
NaCl, 41 x 3 mm
160-5011
CaF2, drilled, 29 x 14 x 4 mm
160-5217
Polyethylene, 41 x 3 mm
160-5007
Ge, 29 x 14 x 4 mm
160-5157
ZnS, 41 x 3 mm
160-5012
Ge, drilled, 29 x 14 x 4 mm
160-1341
ZnSe, 41 x 3 mm
160-1185
KBr, 29 x 14 x 4 mm
160-1184
KBr, drilled, 29 x 14 x 4 mm
160-5009
KRS-5, 29 x 14 x 4 mm
160-5014
KRS-5, drilled, 29 x 14 x 4 mm
Disks, 49 mm Diameter
3 mm T hickness
Part Number
Description
160-5161
ZnS, 49 x 3 mm
160-1153
ZnSe, 49 x 3 mm
6 mm T hickness
Description
160-5027
BaF2, 49 x 6 mm
160-5206
CaF2, 49 x 6 mm
160-5029
CsI, 49 x 6 mm
160-1187
KBr, 49 x 6 mm
160-5205
KRS-5, 49 x 6 mm
160-1166
NaCl, 49 x 6 mm
160-5164
SiO2, 49 x 6 mm
160-5129
SiO2, low OH, 49 x 6 mm
Disks, 50 mm Diameter
3 mm T hickness
Part Number
Description
160-5030
BaF2, 50 x 3 mm
CaF2, 50 x 3 mm
CsI, 50 x 3 mm
160-1186
KBr, 50 x 3 mm
160-1171
KRS-5, 50 x 3 mm
160-1165
NaCl, 50 x 3 mm
160-5177
ZnS, 50 x 3 mm
160-1152
ZnSe, 50 x 3 mm
NaCl, drilled, 29 x 14 x 4 mm
Windows, 38 mm x 19 mm
2 mm T hickness
Part Number
Description
160-1269
AMTIR, 38 x 19 x 2 mm
160-1270
AMTIR, drilled, 38 x 19 x 2 mm
160-1157
Si, 38 x 19 x 2 mm
160-1156
Si, drilled, 38 x 19 x 2 mm
160-1275
ZnS, 38 x 19 x 2 mm
160-1276
ZnS, drilled, 38 x 19 x 2 mm
160-1151
ZnSe, 38 x 19 x 2 mm
160-1150
ZnSe, drilled, 38 x 19 x 2 mm
4 mm T hickness
Part Number
Description
160-1214
BaF2, 38 x 19 x 4 mm
160-1145
BaF2, drilled, 38 x 19 x 4 mm
160-1141
CaF2, 38 x 19 x 4 mm
CaF2, drilled, 38 x 19 x 4 mm
CsI, 38 x 19 x 4 mm
160-1192
CsI, drilled, 38 x 19 x 4 mm
160-1190
Ge, 38 x 19 x 4 mm
160-5032
Ge, drilled, 38 x 19 x 4 mm
160-1130
KBr, 38 x 19 x 4 mm
160-1129
KBr, drilled, 38 x 19 x 4 mm
160-5031
KRS-5, 38 x 19 x 4 mm
160-5016
KRS-5, drilled, 38 x 19 x 4 mm
160-1162
NaCl, 38 x 19 x 4 mm
160-1006
NaCl, 38 x 19 x 4 mm (6-pack)
160-1161
NaCl, drilled, 38 x 19 x 4 mm
160-1292
SiO2, 38 x 19 x 4 mm
160-5130
SiO2, low OH, 38 x 19 x 4 mm
160-1293
SiO2, drilled, 38 x 19 x 4 mm
160-5131
SiO2, drilled, low OH,
38 x 19 x 4 mm
Description
160-1277
ZnS, 41 x 23 x 3 mm
160-1279
ZnS, drilled, 41 x 23 x 3 mm
160-1111
ZnSe, 41 x 23 x 3 mm
160-1280
ZnSe, drilled, 41 x 23 x 3 mm
6 mm T hickness
Part Number
Description
160-5146
BaF2, 41 x 23 x 6 mm
160-5152
BaF2, drilled, 41 x 23 x 6 mm
160-5147
CaF2, 41 x 23 x 6 mm
160-5153
CaF2, drilled, 41 x 23 x 6 mm
160-1183
KBr, 41 x 23 x 6 mm
160-1182
KBr, drilled, 41 x 23 x 6 mm
160-1120
NaCl, 41 x 23 x 6 mm
160-1119
NaCl, drilled, 41 x 23 x 6 mm
Note: For disk and window sizes other than shown
here, please contact PIKE Technologies.
608-274-2721
160-1140
160-1193
Part Number
www.piketech.com
160-1208
160-5173
NaCl, 29 x 14 x 4 mm
160-1163
3 mm T hickness
Pike Technologies
Part Number
160-1164
Windows, 41 mm x 23 mm
T ransmission
Disks, 41 mm Diameter
Note: Products highlighted in red are in stock
and available for immediate delivery.
113
Automated and Manual Technologies
Crystal Polishing Kit –
Extending the Life of IR Transparent Windows
Scratched and fogged windows diminish the quality of transmission
FTIR spectra. Their continuous replacement can be impractical
and quite expensive. A number of standard infrared windows can
be quickly restored to quality condition with the PIKE Technologies
Crystal Polishing Kit. The kit includes all the necessary components
to re-polish KBr and NaCl windows quickly and effectively.
Note: We do not recommend polishing KRS-5 windows due to safety
hazards and for this reason do not include materials for polishing
KRS-5 windows.
O r d e r i n g I n fo r m a t i o n
Features
• Complete kit for polishing IR transparent windows
• Reduces cost of transmission analysis by extending KBr and
NaCl window lifetime
Part Number Description
162-4000
Crystal Polishing Kit
Includes wooden base, glass plates, polishing pads,
brushes and polishing compounds
R eplacement P arts
Part Number Description
162-4010
Glass Plate
162-4011
Polishing Pads (6 ea.)
162-4015
Brushes (6 ea.)
162-4012
Grinding Compound, 400 grit
162-4013
Grinding Compound, 600 grit
162-4014
Polishing Compound
Note: For other options for window polishing, please contact PIKE Technologies.
114
Short-Path Gas Cells –
For Samples with Higher Vapor Phase Concentration
100-mm
Short-Path
HT Cell
T ransmission
PIKE Technologies offers several choices for analysis of gas samples
with component concentrations generally above 1% by weight.
Our Short-Path HT Gas Cells provide high throughput by virtue of
their greater inside diameter providing more energy at the FTIR
detector. The Short-Path HT Gas Cells also include glass stopcocks
for flow input of the gas sample and sealing.
The PIKE Technologies Short-Path EC Gas Cells are recommended
for use with occasional gas sampling and offer an economical choice
with standard septum-styled sealing of the vapor phase sample.
Both our Short-Path HT and EC Gas Cells are available in
50-mm and 100-mm versions. The complete gas cell requires your
selection of the appropriate IR transparent windows. Both HT and
EC Gas Cells are slide mount accessories, compatible with all FTIR
spectrometers.
100-mm
Short-Path
EC Gas Cell
Features
• Gas cells for measuring higher vapor phase concentration
• High throughput and economy versions
• 100-mm and 50-mm pathlengths
• Fits all FTIR spectrometers
O r d e r i n g I n fo r m a t i o n
R eplacement P arts
Part Number Description
Part Number
HT G a s C e l l EC G a s C e l l Description
162-2209
162-2109
Viton O-Rings (2 ea.)
162-2202
162-2102
Cell Window Cap
162-2205
162-2105
Gas Cell Holder
162-2201
162-2101
Glass Body for 100-mm Cell
162-2200
Short-Path HT Gas Cell, 100 mm pathlength
162-2250
Short-Path HT Gas Cell, 50 mm pathlength
162-2100
Short-Path EC Gas Cell, 100 mm pathlength
162-2150
Short-Path EC Gas Cell, 50 mm pathlength
W indows for S hort -P ath G as C ell
162-2155
Glass Body for 50-mm Cell
162-2107
162-2106
Septum Caps (12 ea.)
Note: For options not shown here, please contact PIKE Technologies.
(must select minimum of 2)
Part Number
38 x 6 mm
25 x 4 mm
162-2255
Description
160-1217 BaF2
160-1342
160-1211
CaF2
160-1320
160-1133
KBr
160-1321
160-1124
NaCl
160-1329
160-1114
ZnSe
Notes: For window compatibility please consult the Materials Properties table on
page 125 of this catalog. For additional window selections please see page 112
of this catalog.
608-274-2721
160-1322
www.piketech.com
Notes: The Short-Path Gas Cells include the glass body, o-rings and cell holder.
HT Gas Cells require selection of two 38 mm x 6 mm windows. EC Gas Cells
require selection of two 25 mm x 4 mm windows.
Pike Technologies
S hort -P ath G as C ells
115
Automated and Manual Technologies
Heated Gas Flow Cell –
For Streaming Gas Analysis
Specifications
Temperature Range
Ambient to 300 °C
Accuracy
+/- 0.5% of set point
Voltage
24 VAC
3 wire Pt RTD (low drift, high stability)
Sensor Type
Controllers
Input Voltage
115/230 V, switchable
Output Voltage
10 A/24 VAC
Dimensions (W x D x H)91 x 140 x 121 mm
(excludes baseplate mount)
Features
• High IR throughput, minimum cell volume ideal for
preserving flowing gas composition
• Temperature control to 300 °C
• Your choice of IR transparent windows – user-changeable
• Compatible with most FTIR spectrometers
O r d e r i n g I n fo r m a t i o n
Part Number Description
162-20XX
Heated Gas Flow Cell
Includes cell, high-temp O-rings, and FTIR mounting plate
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
T emperature C ontrollers (must select one)
Part Number Description
The PIKE Technologies Heated Gas Flow Cell is recommended
for high-performance FTIR sampling of flowing gas samples. The
beam-conforming design of the Heated Gas Flow Cell provides
for minimum cell volume (38.5 mL) and a 100 mm pathlength,
compatible with most FTIR spectrometers. This beam-conforming
design also provides maximum IR throughput with no vignette of
the IR beam. The gas cell may be heated up to 300 °C to prevent
condensation of higher molecular weight gas species. The PIKE
Technologies Heated Gas Flow Cell includes standard Swagelok®
fittings for connection to 1/8” tubing and its stainless steel composition is compatible with pressurized applications up to 100 psi.
Temperature control is provided by either digital or digital
PC controllers from PIKE Technologies. The Heated Gas Flow Cell
requires selection of your choice of 38 mm x 6 mm IR transparent
windows and temperature controller.
076-1410
Digital Temperature Control Module, PC Control
076-1210
Digital Temperature Control Module
Note: Digital Temperature Control Module, PC Control includes
PIKE TempPRO software.
IR T ransparent W indows for H eated G as F low C ell
(select minimum of 2)
Part Number
Description
160-1322
BaF2 Window, 38 x 6 mm
160-1320
KBr Window, 38 x 6 mm
160-1343
KRS-5 Window, 38 x 6 mm
160-1329
ZnSe Window, 38 x 6 mm
Notes: For window compatibility please consult the Windows Materials Properties
table on page 125 of this catalog. For additional window selections please see page
112 of this catalog.
R eplacement P arts and O ptions
Part Number Description
162-2009
Viton O-Rings, max. temp. 200 ºC, (2 ea.)
162-2309
High-Temperature O-Rings, max. temp. 325 ºC (1 ea.)
162-2308
High-Temperature O-Rings, max. temp. 325 ºC (4 ea.)
Notes: Gas Cell requires 4 O-rings total. For high-temperature purge tubes and other
options, please contact PIKE Technologies.
Optical geometry for PIKE Technologies Heated Gas Flow Cell.
116
Low-Volume Heated Gas Cell –
Near-Instantaneous Feedback on Compositional Changes
Specifications
Features
• Short pathlength, 10 or 12 cm
• Volume less than 5 ml
• Temperature control to 300 °C
• Precision transfer optics for beam focusing
The new Low-Volume Heated Gas Cell by PIKE Technologies is ideal
for infrared applications such as determining and quantifying offgassing and headspace species where gas volume is limited. At less
than 5 ml, the gas cell volume is a fraction of that found in typical
short-path gas cells of similar lengths (10 to 12 cm). It connects
easily to simple gas flow experimental setups as an IR screening
diagnostic tool. Due to its low internal volume, it offers nearinstantaneous feedback on gas compositional changes.
Gas Cell Pathlength
Gas Cell Diameter
Gas Cell Volume
Temperature Range Accuracy
Voltage
Sensor Type
T ransmission
PIKE Technologies’ Low-Volume Heated Gas Cell is an
experimentally attractive, independent solution for the practitioner
dealing with gas analysis and quantitative challenges. In the polymer
materials field, for example, it offers simple gas compositional
analysis of headspace volatiles originating in small-volume sealed
material aging experiments.
To optimize the energy throughput, this unique cell uses a set
of transfer optics that focuses the IR beam from the spectrometer
onto the entrance of the 7-mm bore cell body. The interior of the
gas cell body is highly polished and gold coated for maximum IR
transmission. The gas cell may be heated up to 300 °C to prevent
condensation of higher molecular weight gas species.
10 or 12 cm
7 mm
3.8 or 4.6 ml
Ambient to 300 °C
+/- 0.5% of set point
24 VAC
3-wire Pt RTD (low drift, high stability)
Controllers
Input Voltage
Output Voltage
115/230V
10A/24 VAC
Dimensions (W x D x H)
12 cm pathlength
223 x 110 x 134 mm
197 mm x 110 x 134 mm
(excludes baseplate mount)
1/8” tubing, welded
Gas Ports
O r d e r i n g I n fo r m a t i o n
Part Number Description
164-62XX
Low Volume Heated Gas Cell, 10 cm
164-61XX
Low Volume Heated Gas Cell, 12 cm
Pike Technologies
10 cm pathlength
Note: Replace XX with your spectrometer’s Instrument Code. Click for List >
T emperature C ontrollers (must select one)
Part Number Description
076-1410
Digital Temperature Control Module, PC Control
076-1210
Digital Temperature Control Module
Note: Digital Temperature Controller, PC Control includes PIKE TempPRO software.
13 x 2 mm W indows (must select minimum of two)
Part Number Description
160-1218
BaF2
160-1170NaCl
160-1213
CaF2
160-1115ZnSe
160-1135KBr
160-5201 SiO2
R eplacement P arts
Part Number Description
Volatiles from an ampoule filled with epoxy aged for 2 d at 240 oC;
spectrum shows predominately H2O and CO2 with some evidence of CO,
CH4 and C3H6 .
164-4010
Viton O-Rings, max. temp. 200 ºC (2 ea.)
162-4011
High-Temperature O-Rings, max. temp. 300 ºC (2 ea.)
608-274-2721
Part Number Description
www.piketech.com
Optical geometry for PIKE Technologies’ Low-Volume Heated Gas Cell.
Note: Low-Volume Heated Gas Cell requires 4 O-rings total.
117
Automated and Manual Technologies
Stainless Steel Short-Path Gas Cells –
For Measurement of High Concentration Vapor Components
Specifications
Temperature Range
Ambient to 200 °C or 300 °C
Accuracy
+/- 0.5% of set point
Voltage
115 or 230 VAC
Sensor TypeRTD
Controllers
Features
• Measurement of high concentration vapor phase samples
• Wide range of pathlengths, from 1 to 20 cm
• Heated option up to 300 °C
• Baseplate-mounted for stability in the sample
Digital Display
Input Voltage
Output Voltage
+/- 0.1 °C
115/230 V, switchable
10 A/24 VAC
All cells are delivered with welded VCR fittings. To offer the
greatest flexibility, users may optimize their configuration further by
choosing Swagelok valves with VCR or 1/4” compression termination.
PIKE gas cells have been designed for easy maintenance and cleaning.
Our gas cells are baseplate-mounted for stability in the spectrometer
sample compartment and offer purge collars to eliminate atmospheric
water vapor and CO2 interferences in the spectrum.
Custom pathlengths and cell materials are available. Contact
PIKE Technologies for special orders.
compartment
For analyzing more concentrated gases, PIKE Technologies is offering
Stainless Steel Short-Path Gas Cells. The durable construction of
the metal body may be used under pressure when matched with
a suitable IR window. Cell pathlengths are 1, 2, 5, 10, 15, and
20 cm. For maximum precision or to prevent condensation of
specific components, heated models are available for a maximum
temperature of 200 and 300 °C.
1/4” termination
Heated Stainless Steel
Short-Path Gas Cell
118
Valve with VCR termination
O r d e r i n g I n fo r m a t i o n
S tainless S teel S hort -P ath G as C ell
Part Number Description
IR T ransparent W indows for S tainless S teel
S hort -P ath G as C ell (select minimum of 2)
Description
Stainless Steel Gas Cell, 5 cm
160-1217
160-1322
BaF2
164-20XX
Stainless Steel Gas Cell, 10 cm
160-1211
160-1342
CaF2
164-27XX
Stainless Steel Gas Cell, 15 cm
160-1133
160-1320
KBr
Stainless Steel Gas Cell, 20 cm
160-1127
160-1343
KRS-5
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Windows not included; order separately. 1 and 2 cm pathlength gas cells use
25 x 4 mm windows and all others use 38 x 6 mm windows. Not all pathlengths
fit commercial spectrometer sample compartments.
160-1124
160-1321
NaCl
160-1114
160-1239
ZnSe
160-1110
-------------
ZnSe, Anti-Reflective Coating, 1-side
H eated S hort -P ath G as C ells
160-1109
------------- ZnSe, Anti-Reflective Coating, 2-sides
Stainless Steel Gas Cell, 1 cm
164-22XX
164-25XX
164-29XX
Part Number
2 0 0 o C
3 0 0 o C
Description
V alves and R eplacement P arts
164-41XX164-31XX
Heated Stainless Steel Gas Cell, 1 cm
Part Number Description
164-42XX164-32XX
Heated Stainless Steel Gas Cell, 2 cm
164-4000
VCR Valve to VCR Termination Kit
164-45XX164-35XX
Heated Stainless Steel Gas Cell, 5 cm
164-4001
Valve to 1/4 inch Termination Kit
164-40XX164-30XX
Heated Stainless Steel Gas Cell, 10 cm
164-4002
1/4 inch Termination Kit
164-47XX
Heated Stainless Steel Gas Cell, 15 cm
164-4006
Viton O-Rings, 25 mm, max. temp. 200 ºC (2 ea.)
164-4008
Viton O-Rings, 38 mm, max. temp. 200 ºC (2 ea.)
164-4007
High Temperature O-Rings, 25 mm, 300 ºC (2 ea.)
164-4009
High Temperature O-Rings, 38 mm, 300 ºC (2 ea.)
-------------
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Windows not included; order separately. 1 and 2 cm pathlength gas cells use
25 x 4 mm windows and all others use 38 x 6 mm windows. Not all pathlengths
and heating options fit commercial spectrometer sample compartments. Hightemperature O-rings are included with the 300 oC model. Heated short-path gas
cells include a digital temperature controller and heating assembly. Purging is
not an option on the 15 cm heated gas cell. Please contact PIKE Technologies for
custom pathlengths.
T ransmission
Stainless Steel Gas Cell, 2 cm
Part Number
25 x 4 mm
38 x 6 mm
(5, 10, 15, 20 cm)
(1, 2 cm)
164-21XX
Notes: Fitting kits include one for inlet and one for outlet. Contact us for other
fitting options. Gas cell requires 4 O-rings total.
Pike Technologies
www.piketech.com
608-274-2721
119
Automated and Manual Technologies
Long-Path Gas Cells –
For Measurement of Low Concentration Vapor Components
C-H stretch spectral region for methane gas.
The anodized aluminum base includes spectrometer-specific
baseplate allowing placement of the accessory in the FTIR sample
compartment. As a standard feature, the optical base is fully
purgeable allowing for the elimination of atmospheric water vapor
and CO2 interference in the spectrum.
Features
• Long-Path gas cells for measurements of vapor species
to ppb levels
• Fixed and variable pathlength versions
• Heated versions available up to 200 °C
• Standard fully purgeable optics
• Fits most FTIR spectrometers
PIKE Technologies offers several Long-Path Gas Cells for analysis
of trace components in gas samples – typical concentrations may
range from the ppm to ppb levels. The Long-Path Cells feature a
folded path design providing an extended pathlength within a
compact dimension. The FTIR beam enters the cell through an IR
transparent window and reflects a number of times between the
accessory mirrors before exiting to the detector. The number of
reflections is determined by the optical configuration of the cell
and may be selected as a permanently aligned version or a
user-adjustable version (variable-path cells). Typical applications
include air pollution studies, gas purity determinations, monitoring
of industrial processes, exhaust gas analysis and many others.
All Long-Path Gas Cells are manufactured by PIKE Technologies.
The fixed and variable long-path body assemblies are nickel-coated
aluminum, stainless steel or heavy-wall borosilicate glass. Gas cells
may be operated under vacuum or pressure. The top of the cell
is enclosed by the valve assembly with stainless steel Swagelok
valves with barb fittings. Tube compression fittings are available
upon request.
For optimal performance the mirrors have been diamond
turned and coated with the highest quality gold for maximum
reflectivity and inertness. The accessory mirrors are mounted
permanently with mechanical mirror mounts to eliminate
out-gassing chemicals that may occur when using epoxies to
secure the mirrors. Windows are easily replaceable and a variety
of window materials are available.
120
Variable-Path
Gas Cell
The construction and main components of the variable-path
gas cells are identical with those described above, with an exception
of the internal mirror assembly. The cell has an adjustable mirror
located at the top of the enclosure
(position controlled with a micrometer)
and one stationary mirror. Adjustments to the mirror position allow
selection of different pathlengths
supported by the cell. The variablepath gas cell has an integrated
laser that enables the determination
of the pathlength by counting the
number of laser reflections on the
bottom mirror.
Laser reflections shown on
the bottom mirror of the
variable-path gas cell for
pathlength determination.
Long-Path Gas Cell Specifications
2.4 m
5.0 m Fixed
Fixed
Base Path (mm)100
Body Material
Glass or Metal
500
Glass or Metal
30.0 m
Fixed
1–16 m
Variable
625
333
Glass
Gold
Gold
Gold
Gold
Gold
Window MaterialKBr
KBr
KBr
KBr
KBr
KBr
Window Dimension (mm)
37.5 x 4
# Window1
25 x 4
2
25 x 4
2
25 x 4
2
25 x 4
2
25 x 4
2
0.5
2.2
7.2
12.8
3.5
Heated Long-Path Gas Cell Specifications
Temperature Range
Ambient to 200 °C
Accuracy
+/- 0.5%
115 or 230 VAC
Voltage
Sensor TypeRTD
Controllers
Digital Display
Input Voltage
Output Voltage
+/- 0.1 °C
115 or 230 V, specify
115 or 230 VAC/10A, specify
Some gas measurement applications require temperature
control for higher precision or to prevent condensation of specific
components. PIKE Technologies offers heated versions of our fixedand variable-path gas cells up to 200 °C. For temperature accuracy,
the temperature sensor has been embedded inside the gas cell as
opposed to mounted on the exterior of the cell.
Contact PIKE Technologies on
how to upgrade an existing cell
to the heated version. Custom
pathlengths and cell materials
are available. Contact us for
special orders.
T ransmission
Glass
Optics CoatingsGold
Cell Volume (L)0.1
Metal
250
20.0 m Fixed
Metal
157
10.0 m Fixed
Note: Other line voltages may require an additional transformer.
5-m Heated Gas Cell
Pike Technologies
www.piketech.com
608-274-2721
121
Automated and Manual Technologies
O r d e r i n g I n fo r m a t i o n
L ong -P ath G as C ells
H eated L ong -P ath G as C ells
Part Number Description
Part Number Description
163-12XX
2.4 m Metal Gas Cell
163-42XX
163-13XX
2.4 m Stainless Steel Gas Cell
163-42XX-30 2.4 m Heated Metal Gas Cell, 230 V
163-15XX
5 m Metal Gas Cell
163-35XX
163-14XX
5 m Stainless Steel Gas Cell
163-35XX-30 2.4 Heated Stainless Steel Gas Cell, 230 V
163-10XX
10 m Metal Gas Cell
163-45XX
163-17XX
10 m Stainless Steel Gas Cell
163-45XX-30 5 m Heated Metal Gas Cell, 230 V
163-11XX
10 m Glass Gas Cell
163-31XX
163-16XX
1–16v m Glass Gas Cell
163-31XX-30 5 m Heated Stainless Steel Gas Cell, 230 V
163-18XX
20 m Stainless Steel Gas Cell
163-40XX
163-20XX
20 m Glass Gas Cell
163-40XX-30 10 m Heated Metal Gas Cell, 230 V
163-30XX
30 m Glass Gas Cell
163-32XX
2.4 Heated Stainless Steel Gas Cell, 115 V
5 m Heated Metal Gas Cell, 115 V
5 m Heated Stainless Steel Gas Cell, 115 V
10 m Heated Metal Gas Cell, 115 V
10 m Heated Stainless Steel Gas Cell, 115 V
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Metal Gas Cell bodies are made of nickel-plated aluminum. Long-Path Gas Cells
include KBr window(s). Additional window materials can be ordered from the
table in the next column.
163-32XX-30 10 m Heated Stainless Steel Gas Cell, 230 V
R eplacement P arts
163-46XX
Part Number Description
076-1240
Long-Path Gas Cell Temperature Control Module
076-1440
Long-Path Gas Cell Temperature Control Module, PC control
163-1009
Pathlength Verification Tool, 2.4 m and 5 m
163-10910
Pathlength Verification Tool, 10 m and 20 m
163-1001 Viton Gas Cell Window O-Ring, 5, 10, 20, 16v m (4 ea.)
163-1208
Perfluoroelastomer O-Ring Kit, 2.4 m
163-1506
Perfluoroelastomer O-Ring Kit, 5 m
163-1007
Perfluoroelastomer O-Ring Kit, 10 m
163-2006
Perfluoroelastomer O-Ring Kit, 20 m
Note: Temperature control modules are 115/230 V switchable. PC control module
includes PIKE Technologies’ TempPRO software. Please call PIKE Technologies for
replacement O-rings or other parts not listed here.
122
2.4 m Heated Metal Gas Cell, 115 V
163-41XX
10 m Heated Glass Gas Cell, 115 V
163-41XX-30 10 m Heated Glass Gas Cell, 230 V
1–16v Heated Glass Gas Cell, 115 V
163-46XX-30 1–16v Heated Glass Gas Cell, 230 V
163-43XX
20 m Heated Glass Gas Cell, 115 V
163-43XX-30 20 m Heated Glass Gas Cell, 230 V
163-33XX
20 m Heated Stainless Steel Gas Cell, 115 V
163-33XX-30 20 m Heated Stainless Steel Gas Cell, 230 V
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Metal Gas Cell bodies are made of nickel-plated aluminum. Heated Long-Path Gas
Cells include KBr window(s). Additional window materials can be ordered from the
table below. Heated Long-Path Gas Cells include a digital temperature controller
and heating jacket. Contact PIKE Technologies for configurations using PC control
temperature module including TempPRO software. Heated Long-Path Gas Cells may
be heated to 200 °C.
R eplacement W indows
Part Number
25 x 4 mm
37.5 x 4 mm
Description
160-1217
160-1281
BaF2
160-1211
160-1287
CaF2
160-1133
160-1288
KBr
160-1178
160-1289
KCl
160-1127
------------
KRS-5
160-1124
160-1290
NaCl
160-1114
160-1291
ZnSe
160-1110
160-1286
ZnSe, Anti-Reflective Coating 1-Side
160-1109
------------
ZnSe, Anti-Reflective Coating 2-Sides
Transmission Sampling Techniques – Theory and Applications
Where
Sample Preparation and Analysis
Liquids
Most liquids and dissolved solids are easy to measure by
transmission. Viscous liquids or pastes can be simply pressed
between two IR transparent windows and measured by FTIR.
T ransmission
FTIR sampling by transmission is a very popular method for
collection of infrared spectra. Its use is easy to explain – the
methods are intuitive and do not require sophisticated sampling
accessories. In many cases, the sample can be placed directly into
the path of the infrared beam (with the help of sample holder) and
scanned. Further benefits of transmission sampling techniques
include compatibility with automated sampling and microsampling
techniques such as IR Microscopy.
Transmission techniques are well documented and have been
successfully used for many years. A large number of spectral
libraries contain transmission spectra and are often used as
references for the purpose of qualitative analysis. Transmission
techniques offer many advantages and should be used whenever
possible, unless reliable sample preparation becomes too difficult,
too time consuming or impossible. Transmission is also widely
used for quantitative applications, as significant numbers of basic
measurements adhere to the Beer-Lambert law. The law provides
a mathematical relationship between the infrared radiation
absorbed by the sample and the sample concentration:
A=a•b•c
A = absorbance
a = absorptivity
b = pathlength
c = sample concentration
Thin liquids or samples in solvent may be best run by using a
demountable liquid cell or a sealed cell, consisting of two windows
with a precision spacer in-between. One of the windows has two
drilled holes for the introduction and evacuation of the sample.
A large number of cell options are available – these include
permanently sealed cells and demountable cells with different
window materials and a wide selection of spacers.
The pathlength of liquid cells can be easily measured with
your FTIR spectrometer. Just place the empty cell into the FTIR
and collect its spectrum. The frequency of the sine wave spectrum
(produced by back reflection within the cell) provides the
pathlength using the following equation;
P = (10 • N) / (2 • ∆ cm-1)
Where
It is very important to select compatible IR transparent windows
for your liquid samples. Please refer to the table on the last page
of this note to select your windows. If you still have questions,
please call us.
www.piketech.com
P = pathlength of cell in mm
N = number of fringes within ∆ cm-1
∆ cm-1 = wavenumber difference of fringe count
Pike Technologies
The Beer-Lambert law states that absorbance is linearly
proportional to sample concentration (with sample pathlength
and absorptivity constant). The actual measurements are generated
in percent transmittance (which is not a linear function of
concentration); however, they can be converted in real time to
absorbance by all modern FTIR software packages. As mentioned
before, transmission measurements are intuitive and simple. Many
samples are too thick to be measured directly and they have to be
processed in some way before meaningful data can be collected.
Some of the sample preparation techniques are time consuming
and can be destructive. Liquids and pastes are generally the easiest
samples to run. A large number of liquid cells and windows are
available for liquid measurements. Solid samples (with the exception
of thin films) require sample preparation – making a pellet
(typically potassium bromide – KBr) or a mull. Gas samples require
a suitable gas cell with a pathlength sufficient to detect the desired
component.
FTIR spectrum of 1 drop of extra virgin olive oil pressed between
25-mm KBr windows and held in the IR beam using the PIKE Universal
Sample Holder.
608-274-2721
123
Automated and Manual Technologies
Solids
The easiest to analyze are film and polymer samples less than
200 micrometers thick (ideal thickness for the major component
of a polymer film is about 20 microns). These samples can be
simply placed into a sample holder and immediately scanned.
However, the majority of solid materials must be prepared
before their infrared spectra can be collected. In many cases
sample preparation involves grinding of the sample and mixing it
with an IR transparent material such as KBr and then pressing a
pellet. While this method of solids analysis is time consuming, it
produces an excellent result.
Polymer film from product packaging material – held in place with
the PIKE Universal Sample Holder. Polymer is identified as Atactic
Polypropylene and the film is determined to be 27.1 microns thick.
FTIR spectrum of caffeine prepared as a 13-mm KBr Pellet and held in
position with the PIKE Sampling Card.
The thickness of the polymer film can be calculated from the
fringe pattern in the spectrum using the following equation:
Solid Sample Preparation Tips
T = (10000 • N) / (2 • n • ∆ cm )
-1
Where
T = thickness of polymer film in microns
N = number of fringes within ∆ cm-1
∆ cm-1 = wavenumber difference of fringe count
n = refractive index of polymer
The same procedure can be used for samples which can be
sliced and pressed to an appropriate thickness – especially for IR
microsampling. PIKE Technologies’ Heated Platens Accessory is ideal
for making thin polymer films.
For IR microsampling, one can place a small sliced sample
into a sample compression cell and apply pressure to hold the
sample and to thin it to a useable thickness – as shown in the
following spectral data.
Micro spectrum of a layered polymer using a PIKE µMAX IR Microscope
and Compression Cell with KBr windows.
124
The best method for preparation of solid samples involves mixing
the sample (about 5% by weight) with an IR transparent material
(typically KBr) and pressing a pellet. The mixing is best done with
the ShakIR accessory which produces a fully mixed and pulverized
sample in about 20 seconds. The grinding and mixing can also be
done with a mortar and pestle – but not as well. Generation of a pellet
involves pressing the prepared mixture with a hydraulic or hand
press into a hard disk. The pellet, ideally 0.5 to 1 mm thick is then
placed in a transmission holder and scanned. Typically, the pellet
technique provides good quality spectra with a wide spectral range
and no interfering absorbance bands.
Samples which do not grind well and/or are affected by
solvents and mulling agents can be analyzed with high-pressure
techniques. Typical samples include fibers and paint chips. The
accessory used for such applications utilizes two diamond anvils.
Difficult samples are placed between the diamonds and crushed,
compressed and flattened to the thickness necessary to obtain
good-quality FTIR spectra. Diamond cells are transparent to IR
radiation except in the region of 2400 cm-1 to 1700 cm-1. The highpressure diamond cells require the use of a beam condenser or
an infrared microscope.
An alternate method for analysis of solid materials involves
making a mull. Mulls are sample suspensions in Nujol (refined
mineral oil) or Fluorolube (perfluorohydrocarbon). The process
is based upon mixing 1 to 2 drops of the mulling agent with a
ground sample until a uniform paste is formed. The paste is
transferred onto a KBr or other IR transparent disk, placed in
the sample compartment of the spectrometer and scanned. The
advantage of this technique is that it is a relatively quick and simple
procedure; disadvantages include interference from mulling agent
absorption bands. Both Nujol and Fluorolube have characteristic
spectral features and in most cases have to be used as a pair in
order to generate a complete mid IR spectrum. Nujol is used below
1330 cm-1, Fluorolube above 1330 cm-1. Some sample preparation is
needed and the quality of the results and amenability to automation
and microsampling offer significant advantages.
Gases
FTIR Spectrum of Methanol Vapor measured with the PIKE 100-mm gas
cell using 0.50 cm-1 spectral resolution.
Summary
Transmission sampling by FTIR provides an excellent means for
sample identification and quantification of sample components.
Most samples measured by transmission techniques require
some sample preparation; however, the quality of the results
and amenability to automation and microsampling offer
significant advantages.
T ransmission
Analysis of gas samples is a unique form of transmission sampling
by FTIR as the identified sample does not need to be of pure
composition. At high spectral resolution, most gas mixtures can
be identified and quantified since absorbance bands can be
selected within the spectrum, which are resolved and distinct
from other components within the sample.
Simple demountable cells (50 mm to 100 mm) are recommended for samples in a 1–10% by weight concentration range.
For highly dilute samples (ppm to ppb concentrations), longpath cells are required. The long-path cell reflects the IR beam
several times through the sample using a set of mirrors positioned
on the opposite ends of the cell, producing a pathlength from 2.4
to 30 meters – or more. It is important to select window materials
compatible with the investigated sample. Gas sampling accessories
can be fitted with different windows to accommodate the physical
and chemical characteristics of the measured gas. Some gas
measurement applications require temperature control for higher
precision or to prevent condensation of specific components. Special
designs for high-pressure and temperature controlled experiments
are also available.
Properties of Select Infrared Transmitting Materials For Transmission Spectroscopy
Material
Comments
SWL cm-1
LWL cm-1
RI
Solubility g/100 g
Hardness kg/mm 2
MP °C
pH Range
1–9
11000
593
2.50
0.00
170
370
Barium Fluoride
66600
691
1.45
0.17
82
1280
5–8
CaF2
Calcium Fluoride
79500
896
1.40
0.0017
158
1360
5–8
CsI
Cesium Iodide, very hygroscopic, Somewhat Toxic
42000
172
1.73
44
20
621
NA
Diamond
Type IIa, strong IR absorbance 30000
<2
2.40
0.00
5700
between 2700–1800 cm-1, costly
550
flash point
1–14
Ge
Germanium, brittle, becomes opaque at elevated temperatures
5500
432
4.00
0.00
780
936
1–14
KBr
Potassium Bromide, most widely used for mid-IR applications
48800
345
1.52
53
6
730
NA
KRS-5
Thallium Bromide/Thallium Iodide, Extremely Toxic!
17900
204
2.37
0.05
40
414
5–8
NaCl
Sodium Chloride
52600
457
1.49
36
18
Polyethylene
For Far-IR, swells with some organic solvents
625
<4
1.52
801
NA
0.00
110
1.5–14
SiO2
Silicon Dioxide
50000
2315
1.53
0.00
460
1713
1–14
Si
Silicon, strong IR absorbance between 624–590 cm-1
8900
624, 30
3.41
0.00
1150
1420
1–12
ZnS
Zinc Sulfide
17000
690
2.20
0.00
240
1830
5–9
ZnSe
Zinc Selenide
15000
461
2.40
0.00
120
1526
5–9
Notes: The above table is meant to be a general guide – brief and concise. For more information about these materials, consult appropriate reference books and Safety Data
Sheets (MSDS).
608-274-2721
SWL – Shortest wavelength for transmission, 1 mm, 50% transmission
LWL – Longest wavelength for transmission, 1 mm, 50% transmission
RI – Refractive index, at relevant wavelength
MP – Melting point
www.piketech.com
GeAsSe glass, brittle
BaF2
Pike Technologies
AMTIR
125
126
Automated and Manual Technologies
Notes
Special Applications
PIKE Technologies offers several FTIR accessories specially
designed for use in a dedicated sampling environment. Our
semiconductor sampling accessories highlight our dedication
to providing tools to ease and streamline FTIR sampling
technology. If you have special sampling needs not shown in our
catalog, please contact us – we may be able to help.
Vertical Wafer Accessory Page 128
Analysis of semiconductor wafers
MappIR™ Page 129
Fully automated analysis
of 200-mm semiconductor wafers
MAP300™ Page 129
Fully automated analysis
of 300-mm semiconductor wafers
TGA/FTIR Accessory Page 131
Identification and quantification of evolved gases
from thermogravimetric analyzer
GC-FTIR Accessory Page 133
Identification of components separated
in GC experiment
External Sample Module Page 134
Auxiliary sample compartment for added flexibility
and custom applications
Photoacoustic Accessory Page 135
Non-destructive analysis
Introduction
and A pplications
Page 137
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Vertical Wafer Accessory –
For Analysis of Semiconductor Wafers
Features
• Transmission analysis of semiconductor wafers for carbon,
The automated system incorporates two precision stepper
motors for rotation and translation of the plate. The motors are
driven by the Motion Control Unit connected to a PC via USB. The
operation is managed by PIKE AutoPRO software which provides
full user programmability and an easy-to-learn “point-and-click”
environment. Polar or Cartesian (X, Y) coordinates may also be used
to define test points. The AutoPRO software allows complex test
sequences to be set up, stored as methods and implemented with
full flexibility. The Motion Control Unit features a smart power
supply and operates at 85–265 VAC, 47–63 Hz. The data collection
feature of AutoPRO is
compatible with most FTIR
software packages.
The PIKE Technologies
Vertical Wafer Accessory
requires minimum 3.5” beam
height FTIR spectrometers.
Please contact us for more
product details.
oxygen and BPSG
• Manual and/or fully-automated operation
• R-theta (rotation/translation) motion control providing
complete wafer analysis
• Contamination-free wafer mount
• 6”, 5”, 4”, 3” and 2” wafer sizes
• Custom mounts and blanks
O r d e r i n g I n fo r m a t i o n
Part Number Description
PIKE Technologies offers the Vertical Wafer Accessory for analysis
of semiconductor wafers. The Vertical Wafer Accessory is an
in-compartment tool for transmission analysis of semiconductor
wafers for carbon, oxygen and BPSG. The accessory accommodates
wafers up to 6 inches (150 mm) in diameter. Wafers are secured in
a demountable ring. Dimensional tolerances conform to SEMI
standards. Delrin (hard polymer) mounting clips eliminate contact
between the wafer and metal surfaces during the analysis. The clip
mechanism facilitates convenient and repeatable wafer placement.
The wafer support ring may be rotated through 360° and
translated laterally through a distance of over 3” (75 mm) to
produce an R-theta motion covering the entire surface of the
wafer. The ring may be rotated and translated manually or
automatically under stepper motor control using PIKE Technologies
AutoPRO software.
073-16XX
Vertical Wafer Accessory, Manual Version
Includes baseplate mount for your FTIR
073-26XX
Vertical Wafer Accessory, Automated Version
Includes motion control unit and AutoPRO software
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Requires 3.5” beam height or greater in FTIR.
O ptions
Part Number Description
073-3600
6” Wafer Mount, blank
073-3660
Additional Wafer Mount
073-3650
Insert to support 5” wafer
073-3640
Insert to support 4” wafer
073-3630
Insert to support 3” wafer
073-3620
Insert to support 2” wafer
Note: Contact PIKE Technologies for custom plates or options not described here.
128
MappIR and MAP300 –
For Automated Analysis of Semiconductor Wafers
MappIR
MAP300
S pecial A pplications
To minimize interferences of water vapor and carbon dioxide
with infrared measurements, the optical path of the accessories is
equipped with purging lines and can be purged with dry air or
nitrogen. A wafer purge enclosure is offered as an option.
The accessories are controlled by AutoPRO software which
provides a simple user interface for multiple point wafer analysis
(mapping). Up to 320 points with 8-mm beam and 5-mm edge
exclusion can be measured on
a 12-inch wafer. The software
provides ample flexibility in
setting up various experiments.
Features
• Complete hardware and software package for automated,
multi-position measurements and mapping of
semiconductor wafers
Advantages of the AutoPRO Package
• 8-inch (200 mm) and 12-inch (300 mm) semiconductor
• Graphical and intelligent user interface for setting up
mapping patterns
• Optional inserts for wafer sizes from 2 to 12 inches
• EPI, BPSG, oxygen and carbon determination
• Specular reflectance and transmission sampling – standard
• Purgeable accessory for removal of atmospheric
• Selection of wafer size, IR beam diameter and edge exclusion
• USB controller interface
• COM-enabled interface for use with macros/scripting
wafer handling.
• Real-time display of the experiment status
• Ability to save and recall various experimental patterns
• KLA and CSV file importer
Data collection and processing is provided by the spectrometer
software. A number of FTIR manufacturers offer dedicated packages
which fully integrate the accessory with the spectrometer. If such
an option is not available, AutoPRO can be controlled by the
spectrometer’s program via macros. AutoPRO is Windows compliant
and when run separately, it allows configuration, programming and
control of the accessory.
PIKE automated wafer accessories are compatible with most
commercial FTIR spectrometers and software packages.
www.piketech.com
608-274-2721
PIKE Technologies offers fully automated accessories for the analysis
of semiconductor wafers. Our MappIR and MAP300 accessories
provide for analysis of EPI, BPSG, oxygen and carbon in wafer
sizes ranging from 2 to 12 inches (50 to 300 mm).
The MappIR and MAP300 have been developed to provide
the semiconductor industry with affordable, automated tools
for research and quality control of silicon wafers. The MappIR
was developed for the analysis of 8-inch (200 mm) and smaller
semiconductor wafers. The MAP300 is a larger version of this
original design and it is capable of handling 12-inch (300 mm) wafer
formats. The operation, electronics and software are identical for
both systems.
The MappIR and MAP300 accessories mount in the sample
compartment of the FTIR spectrometer. Semiconductor wafers
are held in place by spring-loaded Delrin retaining clips and
are never in contact with the aluminum stage of the accessory.
A standard size slot for a vacuum or mechanical wand is provided
for ease of wafer handling. Individual wafers are rotated and/or
translated by stepper motors in a sequence pre-programmed by
the system operator.
• Polar and/or Cartesian coordinates options
Pike Technologies
interferences
• Operator-selectable or pre-defined multiple point maps
129
O r d e r i n g I n fo r m a t i o n
M app IR and MAP300 A utomated S emiconductor W afer
A ccessories
Part Number Description
016-28XX
MappIR Accessory for 8” Wafers
Includes wafer mount, motion control unit, AutoPRO
software and mount for your FTIR
016-29XX
Purge-Ready MappIR Wafer Accessory for 8” Wafers
Includes wafer mount, motion control unit, AutoPRO software
and mount for your FTIR (order purge enclosure separately)
017-28XX
MAP300 Accessory for 12” Wafers
Includes wafer mount, motion control unit, AutoPRO
software, mount for your FTIR and insert to support 8” wafers
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
P/N 017-28XX is purge enclosure ready. Order optional purge enclosure separately.
O ptions for the M app IR and MAP300 A ccessories
Part Number Description
073-3880 Additional 8” Wafer Mount (MappIR only)
073-3800 Blank Support – for custom wafers (MappIR only)
017-3912 Additional 12” Wafer Mount (MAP300 only)
017-3980 Insert to Support 8” Wafer (MAP300 only)
073-3860 Insert to Support 6” Wafer
073-3850 Insert to Support 5” Wafer
073-3840 Insert to Support 4” Wafer
073-3830 Insert to Support 3” Wafer
073-3820 Insert to Support 2” Wafer
016-3000
Purge Enclosure for MappIR
017-3000
Purge Enclosure for MAP300
Notes: Purge enclosure will not fit with all spectrometer types. For more
options or additional information, contact PIKE Technologies.
2”
3”
4”
Optional purge
enclosure mounted on
8” MappIR accessory.
5”
6”
8”
12”
MAP300
130
MappIR
TGA/FTIR Accessory – Identification and Quantification
of Evolved Gases from Thermogravimetric Analyzer
Features
• Gas cell design conforming to IR beam geometry –
S pecial A pplications
The PIKE Technologies TGA/FTIR Accessory is designed to be an
interface for evolved gas analysis from a thermogravimetric analyzer
(TGA) to your FTIR spectrometer. Evolved gases from the TGA pass
through a heated transfer line into the beam conforming flow cell
in the FTIR sample compartment. As these evolved gases travel
through the flow cell, FTIR spectra are collected and stored for
further processing. Qualitative and quantitative measurements
are doable from sample masses – typically in the low milligram
range. The PIKE TGA/FTIR Accessory is compatible with most FTIR
spectrometers and most TGA instruments.
maximizes IR throughput with minimum cell volume
• 100-mm IR beam pathlength for maximized FTIR sensitivity
• Baseplate-mounted in your FTIR for flexible sampling
• Temperature control settable up to 300 °C for flow cell
and transfer line
• User-changeable IR transparent windows to minimize cost
of operation
• Heated, glass-lined stainless steel transfer line for inert
TGA/FTIR data for cured rubber sample. Upper trace is the Gram-Schmidt
reconstruct of the TGA evolved gases. Lower trace is a carbonyl reconstruction
and an FTIR spectrum from this data set.
transfer of TGA effluent
IR beam conforming optical design of PIKE Technologies
TGA/FTIR Accessory.
Temperature Range
Ambient to 300 °C
Accuracy
+/- 0.5%
Voltage
24 VAC
3 wire Pt RTD (low drift, high stability)
Sensor Type
Controllers
608-274-2721
Input Voltage
110/220 V, switchable
Output Voltage
10 A/24 VAC
Dimensions (W x D x H)91 x 140 x 121 mm
(excludes baseplate mount)
www.piketech.com
Specifications
Pike Technologies
During the TGA analysis sample mass is lost through a
combination of volatilization and degradation of the sample
material. The heated TGA/FTIR system maintains the vapor state
of the evolved gases throughout the FTIR analysis. Typical samples
include polymers, epoxies, fibers and laminates for investigating
deformulation, thermal stability or comparative study applications.
The FTIR spectrometer is set to collect spectra at 10-second
intervals during the evolved gas analysis using the kinetics
software package for your FTIR. With this software you can generate
reconstructions of total IR response verses time or temperature
(Gram-Schmidt) or specific IR band reconstructions to isolate
points of unique component evolutions. FTIR spectra are extracted
from the data set and an identification is made by comparing
these unknown spectra to vapor phase spectral libraries.
131
O r d e r i n g I n fo r m a t i o n
TGA/FTIR A ccessory F low C ell
T emperature C ontrollers for TGA/FTIR A ccessory
Part Number Description
(must select one)
162-24XX
Part Number Description
TGA/FTIR Accessory Flow Cell
Includes mount for your FTIR, exhaust line and
high-temperature O-rings
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
Complete accessory requires selection of IR transparent windows, heated transfer
line and temperature controller. The TGA/FTIR accessory requires installation by a
trained service representative – please consult with your FTIR manufacturer.
IR T ransparent W indows for TGA/FTIR A ccessory
(must select 2 or more)
Dual Digital Temperature Control Module
076-1130
4 Zone Digital Temperature Control Module for Shimadzu TGA
Note: These temperature controllers provide setting for the heated gas cell and the
heated transfer line.
R eplacement P arts and O ptions
Part Number Description
Part Number Description
162-2309
High-Temperature O-Rings, max temp 325 °C, (1 ea.)
160-1320
Window, KBr, 38 x 6 mm
162-2308
High-Temperature O-Rings, max temp 325 °C, (4 ea.)
Window, ZnSe, 38 x 6 mm
Note: Gas cell requires 4 O-rings. For high-temperature purge tubes and other
options, please contact PIKE Technologies.
160-1329
Note: For window compatibility please consult our Materials Properties table on
page 125 of this catalog.
H eated T ransfer L ine for TGA/FTIR A ccessory
(must select one)
Part Number Description
115-0001
Heated Transfer Line for Shimadzu TGA50
Includes evolved gas port modifications
115-0005 Heated Transfer Line for Mettler 851 TGA
115-0006 Heated Transfer Line for Mettler 851e/LF or
TGA-DSC1/2/3 TGA
115-0007 Heated Transfer Line for TA Instruments Q600 TGA
115-0008 Heated Transfer Line for TA Instruments Discovery/Q5000R
115-0009 Heated Transfer Line for TA Instruments Q50/Q500 TGA
115-0010 Heated Transfer Line for TA Instruments 2050/2950
115-0011 Heated Transfer Line for Netzsch TGA
115-0012 Heated Transfer Line for PESTA6/4000 110V TGA
115-0013 Heated Transfer Line for SETARAM
115-0014 Heated Transfer Line for PESTA6/4000 220V TGA
115-0017
TGA Universal Transfer Line
Includes the following adapters; 1/8” to 1/8” union, 1/4” to 1/8” reducing union, 3-mm to 1/8” union, 6-mm to 1/8” reducing union and 6-mm PTFE ferrules
115-0018
PTFE TGA Transfer Line, 230 °C max.
Recommended for TGAs with evolved gas ports made of
ceramic or moving furnace heads
Notes: We will need to know the make and model number of your TGA. Please
consult your TGA supplier to ensure compatibility with evolved gas analysis.
Contact PIKE Technologies about interfacing to other TGA instruments. Unless
noted otherwise, all PIKE transfer lines are 1/8” OD, silica-lined stainless steel,
48” in length and offers a maximum temperature of 300 °C .
132
076-1120
GC-FTIR Accessory –
Combining GC Separation with Identification Power of FTIR
Features
• Isomer identification
• Secondary confirmation of GC-MS results
• 120-mm IR beam pathlength for maximized FTIR sensitivity
• Temperature control settable up to 300 °C for flow cell
sample moves through the GC column and identifying these
compounds by spectroscopy. GC-FTIR is a preferred method for
identifying isomers, which may be incorrectly identified using
GC-MS. In addition, GC-FTIR may be used as a complementary
analytical technique to confirm GC-MS results. Typical applications of GC-FTIR include the analysis of drugs, fragrances, and
other organic compounds found in mixtures.
Specifications
and transfer line
• Purgeable module
Dimensions (W x D x H)
51 x 45 x 27 cm
Weight
16 kg
FTIR Placement
Right or Left Side
Beam Height
Specific for FTIR
Detector OptionsYes
PurgePurgeable
Light Pipe Diameter
Light Pipe Pathlength
Maximum Temperature
1 mm
120 mm
300 °C
O r d e r i n g I n fo r m a t i o n
GC-FTIR B ase A ccessory (must select external beam direction)
Part Number Description
GC-FTIR Accessory, Left Side
T ransfer L ine for GC-FTIR (must select transfer line)
Light Pipe
Part Number Description
115-0050 R eplacement P arts
Part Number Description
Optical geometry of the GC-FTIR Accessory.
160-1135 Window, KBr, 13 mm x 2 mm (single)
160-1008 Window, KBr, 13 mm x 2 mm (6-pack)
140-2001 GC Graphite Window Gasket
140-2010 Ferrule for 0.25-mm coupling (5 ea.)
140-2015 Ferrule for 0.32-mm coupling (5 ea.)
140-2020 Ferrule for 0.53-mm coupling (5 ea.)
608-274-2721
Transfer
Line
GC-FTIR Accessory Transfer Line
www.piketech.com
GC-FTIR Accessory, Right Side
140-10XXL
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
GC-FTIR Accessory includes optics, mounting hardware, narrow-band MCT detector
and detector electronics, heated gas cell and temperature controller. The GC-FTIR
accessory requires installation by a trained service representative; please consult
with your FTIR and GC manufacturer.
Integrated
MCT
Detector
IR Beam
From FTIR
140-10XXR
Pike Technologies
The PIKE Technologies GC-FTIR Accessory is an interface between
the GC and the FTIR instruments. When fully installed, the sample
pathway from the end of the GC column is diverted to a heated gas
cell and back to the GC detector through the use of temperature
controlled transfer lines. To maximize sensitivity, the light pipe is
gold-coated and the accessory includes an on-board MCT detector.
Coupling gas chromatography with infrared spectroscopy
provides an effective method of separating compounds as the
S pecial A pplications
GC-FTIR data for IBMA.
133
External Sample Module –
Extending Sampling Efficiency
Specifications
Dimensions (W x D x H)
615 x 490 x 205 mm
Weight
28 kg
FTIR Placement
Right or Left Side
Beam Height
Sample Compartment Size)
(W x D x H
Detector Options
Screw Hole Grid
Sample Compartment EFL
Specific for FTIR
190 x 265 x 155 mm
DTGS, MCT, others inquire
1” OC, 1/4-20, sealed
6”
PurgePurgeable
Features
Inner, Outer WallsRemovable
FTIR CompatibilityMost
• Utilizes external beam of FTIR – keeps main sample
compartment free for general sampling
• Right and left external beam versions
• Full sized dimensions – for all sample compartment
accessories
• Choice of integrated detector
• Ideal for heated applications or a difficult experimental
setup – saving time and improving reproducibility
• Customizable configuration – removable sample
compartment walls for specific optical layouts
• Vibration isolated design – providing highest spectral
quality
• Compatible with most FTIR spectrometers
• 1” x 1” 10–24 hole grid
The External Sample Module from PIKE Technologies is a versatile
sampling station for FTIR spectrometers. It provides an additional
sample compartment to keep the main sample compartment of
the FTIR free for routine sampling and also provides a location for
a more complex sampling setup. Examples of experiments ideally
suited to using the External Sample Module include a long-path
gas cell, PIKE TGA/FTIR accessory, MappIR™ and the AutoDiff™
(PIKE’s automated diffuse reflectance accessory). The sample
compartment of the External Sample Module is full sized, and
compatible with all PIKE Technologies accessories.
In addition to being a traditional sample compartment, the
External Sample Module has a screw-hole grid for customized optical
layouts with removable inner and outer walls.
The External Sample Module is compatible with either sealed
and desiccated or purged FTIR spectrometers. It may be paired with
most FTIR spectrometers with an external beam.
O r d e r i n g I n fo r m a t i o n
E xternal S ample M odule (must select external beam direction)
Part Number Description
155-10XXR
External Sample Module, Right Side
Includes optics, mounting hardware, electrical cabling for
FTIR, sample compartment windows, purge tubing and fittings
to connect to purge gas
155-10XXL
External Sample Module, Left Side
Includes optics, mounting hardware, electrical cabling for FTIR, sample compartment windows, purge tubing and fittings
to connect to purge gas
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
FTIR must be capable of interfacing with an external detector and have optics
required for the external beam. Requires installation by your FTIR spectrometer
provider. A conversion kit may be required to use your sampling accessory in the
sample compartment – contact PIKE Technologies.
D etector for E xternal S ample M odule
(must select one or more)
Part Number Description
155-2010
DLaTGS Detector for External Sample Module
155-2020
MCT Detector (mid band) for External Sample Module
155-2030
MCT Detector (narrow band) for External Sample Module
155-2040
MCT Detector (wide band) for External Sample Module
Notes: Detectors for the ESM may be exchanged by the customer and are
pin-mounted for easy exchange without alignment. Please ask us about other
detector options.
R eplacement W indows
Part Number Description
160-1186
Optical geometry for right side External Sample Module
134
Window, KBr, 50 x 3 mm
160-5030
Window, BaF2, 50 x 3 mm
160-1165
Window, NaCl, 50 x 3 mm
PA301 and PA101 – Photoacoustic Accessory for Analysis of
Difficult Samples and Depth Profiling
Frequency (Hz) L, 6000 cm-1 L, 3000 cm-1 L, 1000 cm-1
130
224
L, 400 cm-1
5
92
355
10
65 92 159251
25
41 58 100159
2,500
4 6 1016
Table 2: Thermal diffusion depth (L) in microns from PAS sampling in step-scan
mode with phase modulation for a polymer with thermal diffusivity = 0.001 cm 2/s.
PA301
Photoacoustic
Detector
Features
• Versatile and rapid analysis of solid, semi-solid, liquid,
and gas samples
Phase Modulation
Frequency (Hz)
L
Phase Modulation
Frequency (Hz)
L
2126
20013
489
4009
1056
7007
5025
9006
S pecial A pplications
Table 1: Thermal diffusion depth (L) in microns from PAS step scan without
phase modulation and rapid scan sampling modes for a polymer with thermal
diffusivity = 0.001 cm 2/s.
• Ideal sampling technique for highly absorbing samples
• Requires no sample preparation and is non-destructive
• Depth probing capabilities
• Patented optical microphone based on cantilever sensor
technology
• May be used in the NIR/MIR/FIR spectral regions
Heavy oil spectrum collected using the PAS301 (8 cm-1, scan time 25 s)
www.piketech.com
608-274-2721
PA101 is a low-volume gas analyzer having an internal gas
volume of 30 mL. The absorption is measured directly by applying
photoacoustic techniques. This makes the measurement free of drift.
It is the key factor for the unbeatable
stability and reliability without frequent background
measurement. Typical lowvolume applications are
headspace analysis, synthesis
and decomposition process
analysis, and outgassing of
materials measurements.
Typical measurement
concentration for PAS of
the gas phase is in the
sub-ppm region.
Pike Technologies
Photoacoustic spectroscopy (PAS) overcomes drawbacks that may
occur with traditional spectroscopic sampling techniques due to
the physical and chemical nature of the sample. PAS is ideal for
the analysis of highly absorbing samples, layered polymers, fibers,
and samples with varying surface roughness such as minerals and
soils. The technique is non-destructive. Using PA technologies,
Gasera accessories offer high sensitivity, good selectivity and fast
response time for reliable analysis of gases, liquids, and solid
materials. A dedicated gas analyzer and a multipurpose analyzer
for solids, semi-solids, liquids, and fibers are available.
High sensitivity is achieved by using a patented cantilever
pressure sensor that is over hundred times more sensitive compared to a membrane, which is used in conventional techniques.
Gasera’s patented cantilever-type pressure sensor is designed to
significantly improve the sensitivity of photoacoustic spectroscopy.
An extremely thin cantilever portion moves like a flexible door
due to the pressure variations in the surrounding gas. The movement of the free end of the cantilever can be about two orders of
magnitude greater than the movement of the middle point of the
tightened membrane under the same pressure variation. This is
because the cantilever only bends and does not stretch.
Data collection may be performed in rapid-scan mode
optimized at 2.5 kHz or in step-scan mode with or without phase
modulation. In rapid-scan or slow step-scan mode the thermal
diffusion depth, defined as the length to decay 37% (1/e) of the
original thermal wave amplitude, increases at longer wavelengths.
For experiments performed in step-scan mode with phase modulation, the thermal diffusion depth may be linearized, eliminating
the signal dependency on wavelength. Table 1 and 2 summarize
thermal diffusion depths for rapid-scan and step-scan experiments
for a typical polymer. For optimal performance, Helium purge gas
is recommended.
PA101 for gas analysis
135
O r d e r i n g I n fo r m a t i o n
Specifications
PA301 Dimensions (W x D x H)170 x 180 x 95 mm
(excludes baseplate and fittings)
Weight
Operational Conditions
Temperature Range
Humidity Range
3.0 kg
15–35 °C
Below 90% RH
Pressure Range Ambient
Sample Cups10 mm ID x 9 mm H
5 mm ID x 1 mm H
Purge Gas
He (preferred)
PA101
Dimensions (W x D x H)165 x 165 x 290 mm
(excludes baseplate and fittings)
Weight
6.0 kg
Gas Cell Volume
30 mL
Gas Pressure
Temperature
Particulate Size
Operational Conditions
Temperature Range
Humidity Range
Input Power Max
180-11XXPA301
Includes photoacoustic cell, digital signal processing unit,
sampling cups and holders, carbon black reference,
baseplate, KBr window and cabling
180-10XXPA101
Includes photoacoustic cell for gas sampling, digital
processing unit, baseplate, BaF2 window and cabling
180-2010
Gas Flow Meter
Notes: Replace XX with your spectrometer’s Instrument Code. Click for List >
PA301 and PA101 require the gas flow meter.
O ptions
Part Number Description
PAS301 Carbon Black Reference
180-2012
Sample Cups, small
180-2013
Sample Cups, large
180-2014
KBr, 19 x 2 mm
180-2015
BaF2, 19 x 2 mm
0–45 °C
180-2016
Si, 19 x 2 mm
Below 90% RH
180-2017
Quartz, 19 x 2 mm
180-2018
ZnSe, 19 x 2 mm
180-2019
CsI, 19 x 2 mm
180-2020
KBr, 14 x 2 mm
180-2021
BaF2, 14 x 2 mm
180-2022
Si, 14 x 2 mm
180-2023
Quartz, 14 x 2 mm
180-2024
ZnSe, 14 x 2 mm
180-2025
CsI, 14 x 2 mm
300–1500 mbar
Ambient to 50 °C
Less than 1 micron
Power Supply Unit for
PA301 and PA101
Input Voltage
Part Number Description
180-2011
Pressure Range Ambient
P hotoacoustic A ccessories
100–240 VAC; 50–60 Hz
30 W
Notes: PA301 uses one 19 x 2-mm window. PA101 uses one 14 x 2-mm window.
136
Semiconductor Applications – FTIR Sampling Techniques Overview
FTIR spectrum of BPSG on silicon wafer – transmission sampling mode.
Oxygen and carbon may be introduced to the molten silicon
during the manufacturing process. These impurities can be trapped
in the crystal lattice and affect final product characteristics. For
these reasons, both need to be monitored and quantified. FTIR
spectroscopy (transmission measurements) provides excellent
means to perform this analysis. The application uses the absorption
bands of Si-C and Si-O-Si to calculate concentration levels of
substitution carbon and interstitial oxygen. Beer’s law is typically
used to determine their concentrations.
S pecial A pplications
FTIR spectroscopy has established itself as a method of choice in
several areas of industrial manufacturing. One of them is the quality
control of semiconductor wafers. Here, the FTIR spectrometers
are commonly used to measure Phosphosilicate glass (PSG) and
Borophosphosilicate glass (BPSG) films, epitaxial film (EPI) thickness
and interstitial oxygen and substitution carbon content.
Addition of boron and phosphorus to silicate glass during
manufacturing improves the final product uniformity and reduces
glass forming temperatures. Borophosphosilicate glass (BPSG) melts
100 °C lower than Phosphosilicate glass (PSG) and offers better flow
characteristics. To maintain and optimize production processes,
evaluation and verification of doping levels is required. FTIR allows
simultaneous measurements of boron and phosphorus as well as
the thickness of the glass in a quick and nondestructive procedure.
The measurements are based on the interpretation of transmission
spectra and quantification of boron, phosphorus and Si-O bands.
K-matrix or Partial Least Squares (PLS) methods are used for concentration/thickness calculations.
The epitaxial film (EPI) is a grown crystal layer having the
same crystallographic orientation as the substrate crystal wafer.
The epitaxial film differs from the substrate base as it is modified
with various additives. Accurate, fast and precise determination of
the EPI film thickness is important in the manufacturing process
since film thickness and uniformity play a critical role in etching
time and device yield across the wafer surface. Specular
reflectance is used in FTIR measurements of the epitaxial layer
thickness. The infrared beam enters the EPI layer, reflects off the
substrate surface and makes another pass through the film when
exiting. The film thickness calculations are based on one of the
following methods:
• Interference measurements – also called Constant Angle Reflection
Interference Spectroscopy or CARIS. This method
uses the interference fringe pattern obtained in the specular
reflectance experiment.
• Second Fourier Transform of spectral response data (CEPSTRUM).
This method takes the difference of two spectral response curves
and performs a second Fourier transform which provides signal
intensity versus sample thickness information.
Pike Technologies
• I nterferogram subtraction – based on the measurement of
the primary and secondary interferogram of the sample and subtraction of this signal from that of the reference material.
www.piketech.com
608-274-2721
137
Notes
138
UV-Vis Accessories
PIKE is addressing the growing need for more sophisticated
UV-Vis accessories by featuring research-style specular
reflectance accessories, polarizers and automated sampling
stages. We also include a selection of most commonly used
UV-Vis cuvettes and cuvette holders. Please contact us to
discuss customized options.
UV-Vis Cuvettes, Cells, Vials, Holders Page 140
Peltier-Controlled Cuvette Holders Page 142
For Experiments Under Tightly Controlled
Temperature Conditions
Falcon UV-Vis Page 144
Precise Cell Temperature Control Accessory
UV-Vis DiffusIR™ Page 145
Diffuse Reflectance Accessory
UV-Vis Polarizers Page 147
Manual and Automated
UV-Vis Spec Page 149
Slide Mounted Specular Reflectance Accessories
UV-Vis 10Spec and 85Spec Page 150
Fixed Angle Specular Reflectance Accessories
UV-Vis VeeMAX™ Page 152
Variable Angle Specular Reflectance Accessory
Automated R-Theta Stages Page 154
For UV-Vis Spectrophotometers
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Sophisticated Science
UV-Vis Cuvettes, Cells, Vials and Holders
PIKE Technologies offers a selection of the most popular cuvettes,
vials and cell holders used in the field of UV-Vis spectrophotometry.
The cuvettes are manufactured using a heat fusing method which
ensures that they are fused into a single homogeneous unit. Cuvettes
are carefully annealed to remove any residual strain for maximum
cell integrity and physical strength.
The cells can be used with most solvents and acidic solutions.
Hydrofluoric acid (HF) and strong bases (pH >9) will negatively affect
the cell surfaces.
Specifications
Window Thickness
Beam Height (Z-dimension)
1.25 mm
8.5 mm and 11 mm
Optical Glass Spectral Range
334 to 2500 nm
Far UV Quartz Spectral Range
170 to 2700 nm
220 to 3800 nm
NIR Quartz Spectral Range
O r d e r i n g I n fo r m a t i o n
S tandard R ectangular C uvettes
Pathlength
Volume
mm
mL
Optical Glass (334–2500 nm)
With PTFE Cover With PTFE Stopper Part Number
Part Number
Far UV Quartz (170–2700 nm)
With PTFE Cover
With PTFE Stopper Part Number
Part Number
NIR Quartz (220–3800 nm)
With PTFE Cover With PTFE Stopper
Part Number
Part Number
1
0.40
162-0220162-0228162-0236162-0244162-0252162-0260
2
0.70
162-0221162-0229162-0237162-0245162-0253162-0261
5
1.70
162-0222162-0230162-0238162-0246162-0254162-0262
10
3.50
162-0223162-0231162-0239162-0247162-0255162-0263
20
7.00
162-0224162-0232162-0240162-0248162-0256162-0264
40
14.00
162-0225162-0233162-0241162-0249162-0257162-0265
50
17.50
162-0226162-0234162-0242162-0250162-0258162-0266
100
35.00
162-0227162-0235162-0243162-0251162-0259162-0267
S emi - micro R ectangular C uvettes – 4-mm O pening
Pathlength
mm
Volume
mL
With PTFE Cover/Clear
Part Number
With PTFE Cover/Black Walled
Part Number
With PTFE Stopper/Clear
Part Number
With PTFE Stopper/Black Walled
Part Number
Optical Glass (320–2500 nm)
5
0.70162-0268
162-0273
162-0278
162-0283
10
1.40 162-0269
162-0274
162-0279
162-0284
20
2.80 162-0270
162-0275
162-0280
162-0285
40
5.60 162-0271
162-0276
162-0281
162-0286
50
7.00 162-0272
162-0277
162-0282
162-0287
Far UV Quartz (170–2700 nm)
5
0.70162-0288
162-0293
162-0298
162-0303
10
1.40 162-0289
162-0294
162-0299
162-0304
20
2.80 162-0290
162-0295
162-0300
162-0305
40
5.60 162-0291
162-0296
162-0301
162-0306
50
7.00 162-0292
162-0297
162-0302
162-0307
With PTFE Cover/Black Walled
Part Number
With PTFE Stopper/Clear
Part Number
With PTFE Stopper/Black Walled
Part Number
M icro R ectangular C uvettes – 2-mm O pening
Pathlength
mm
Volume
mL
With PTFE Cover/Clear
Part Number
Optical Glass (320–2500 nm)
5
0.35162-0308
162-0313
162-0318
162-0323
10
0.70 162-0309
162-0314
162-0319
162-0324
20
1.40 162-0310
162-0315
162-0320
162-0325
40
2.80 162-0311
162-0316
162-0321
162-0326
50
3.50 162-0312
162-0317
162-0322
162-0327
Far UV Quartz (170–2700 nm)
140
5
0.35162-0328
162-0333
162-0338
162-0343
10
0.70 162-0329
162-0334
162-0339
162-0344
20
1.40 162-0330
162-0335
162-0340
162-0345
40
2.80 162-0331
162-0336
162-0341
162-0346
50
3.50 162-0332
162-0337
162-0342
162-0347
O r d e r i n g I n fo r m a t i o n
Pathlength
mm
VolumeOptical Glass mL
(334–2500 nm)
Far UV Quartz NIR Quartz
(170–2700 nm)
(220–3800 nm)
C ell H olders , S pacers and S toppers
Part Number Description
111-3650
Cuvette Holder, 10 mm
10
2.80 162-1831 162-1841
162-1801
111-3660
Adjustable Cuvette Holder, 10–100 mm
20
5.60 162-1832 162-1842
162-1802
161-2530 Slide Sample Holder, Cylindrical Cell, 10–20 mm
50
14.10 162-1835 162-1845
162-1805
161-2540 Slide Sample Holder, Cylindrical Cell, 50 mm
100
28.20 162-1840
162-1810
161-2550 Slide Sample Holder, Cylindrical Cell, 100 mm
162-1201
Spacer for 1-mm pathlength cuvette
162-1202
Spacer for 2-mm pathlength cuvette
162-1205
Spacer for 5-mm pathlength cuvette
162-1850
Notes: Please contact PIKE Technologies for replacement Teflon stoppers, covers,
and for items not described on this list.
UV-V is A ccessories
Cylindrical Cells with Teflon Stoppers –22-mm Diameter
Cylindrical cells
10-mm Cuvette Holder
V ials and D isposable C uvettes
Part Number Description
162-0205
5-mm Disposable Glass Vials, 5 x 42 mm (200 ea.)
162-0208
8-mm Glass Vials, 8 x 43 mm (200 ea.)
162-0212
12-mm Glass Vials, 12 x 32 mm (200 ea.)
Adjustable Cuvette Holder
162-0349Polystyrene, Semi-micro Disposable Cuvettes,
10-mm pathlength, 1.5 mL (100 ea.)
608-274-2721
Spacers for 1-, 2and 5-mm cells
www.piketech.com
Cylindrical Cell Holder
Pike Technologies
162-0348Polystyrene, Disposable Cuvettes, 10-mm pathlength,
4.5 mL (100 ea.)
141
Sophisticated Science
Peltier-Controlled Cuvette Holders for UV-Vis Spectrophotometers –
Experiments Under Tightly Controlled Temperature Conditions
Features
• Fast temperature response
• Precision temperature control
• Variable built-in magnetic stirring
• Single- and dual-beam configuration
The new series of PIKE Technologies Peltier accessories includes
liquid-cooled cuvette holders, two-channel Temperature Controller
and optional Liquid Recirculator. The complete PIKE Peltier Cuvette
Accessory requires Peltier cuvette holders, Temperature Controller
and Liquid Recirculator. With its efficient design, the Peltier
Accessory offers precision temperature control and highly responsive
ramping.
The cuvette holder can be used with single- and dual-beam
spectrophotometers, and is offered in single or twin configurations.
Each temperature-controlled cuvette holder features an efficient
heat exchange design, variable speed magnetic stirrers, and a
thermoelectric cooler based on Peltier principle. Liquid flow is used
to remove excess heat from Peltier elements.
The Peltier cuvette holders are designed to accommodate
standard size 10-mm pathlength cuvettes and shorter path cuvettes
with appropriate spacers. The holders accommodate 8.5-mm and
15-mm beam Z-height configurations.
The temperature controller is configured for a single or dual
channel used with the single and twin design, respectively. Within
each channel, temperature may be controlled from the precision
block RTD sensor or from an optional external temperature RTD
probe inserted into the sample cell. All temperature controllers have
a USB for PC communication and may be used with PIKE TempPRO
software, which provides functions for accessory programming,
setting of temperature points and ramping. Temperature controllers
have a touchscreen LCD panel
featuring intuitive, menu-driven
programming. Single set points or
simple ramping functions can be
preprogrammed and performed.
Dedicated temperature
controller main menu
PIKE TempPro software for kinetic experiments
Specifications
Cuvette Holders
Precision
142
Temperature Accuracy
-5 °C–110 °C
+/- 0.05 °C
+/- 0.3 °C from -5 °C to 110 °C
RTD Probe
2 Wire Pt RTD
(low drift, high stability)
Stirring Speeds 10 Steps, Variable
Cuvette Size 12.5 mm x 12.5 mm
(accommodates smaller size with
appropriate spacers)
Z-height 8.5 mm and 15 mm
Temperature Controller
Precision +/- 0.1 °C
Channels Single or Dual
Functions
Set point, temperature ramping
Computer Interface
Accessory performance showing block temperature (red) and sample
probe temperature (blue).
Temperature Range
USB
Input Voltage
90–264 V, auto setting, external
power supply
Output Voltage
Dimensions (W x D x H)
15 VDC/60 W maximum
83 x 105 x 85 mm
O r d e r i n g I n fo r m a t i o n
S pacers
171-70XXX
Peltier Cuvette Holder, single – liquid regulated
Part Number Description
171-80XXX
Peltier Cuvette Holder, twin – liquid regulated
162-1201
Spacer for 1-mm pathlength cuvette
171-1250
Temperature Control Unit, LCD/PC, single channel
162-1202
Spacer for 2-mm pathlength cuvette
171-2250
Temperature Control Unit, LCD/PC, dual channel
162-1205
Spacer for 5-mm pathlength cuvette
171-1905
RTD Probe for Peltier cuvette
170-1100
Liquid Recirculator for Peltier cuvette
162-1905
Micro Stir Bar, 6.35 mm (l) x 3 mm (dia)
Notes: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
Temperature control unit must be selected.
S tandard R ectangular C uvettes
Pathlength
mm
1
Volume
mL
0.40
Optical Glass (334–2500 nm)
With PTFE Cover
With PTFE Stopper Part Number
Part Number
162-0220162-0228
NIR Quartz (220–3800 nm)
With PTFE Cover
With PTFE Stopper Part Number
Part Number
162-0252 162-0260
2
0.70
162-0221162-0229
162-0253 162-0261
5
1.70
162-0222162-0230
162-0254 162-0262
10
3.50
162-0223 162-0231
162-0255 162-0263
20
7.00
162-0224 162-0232
162-0256 162-0264
40
14.00
162-0225 162-0233
162-0257 162-0265
50
17.50
162-0226 162-0234
162-0258 162-0266
100
35.00
162-0227 162-0235
162-0259
UV-V is A ccessories
Part Number Description
162-0267
Note: Refer to page 140 for a full selection of cuvettes.
Pike Technologies
www.piketech.com
608-274-2721
143
Falcon UV-Vis –
Precise Cell Temperature Control Accessory
Sophisticated Science
O r d e r i n g I n fo r m a t i o n
Part Number Description
110-60XXX UV-Vis Falcon Base
Includes temperature controlled base (digital temperature
controller and sample holder need to be selected from the
tables below for complete system)
Note: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
T emperature C ontrollers (must choose one)
Part Number Description
Features
• Fast and easy analysis of samples under precise Peltier
temperature control
076-1230
Digital Temperature Control Module
076-1430
Digital Temperature Control Module, PC Control (USB)
S ample H olders (must choose at least one)
• Choice of cuvette and vial adapters
• Compatible with 1-mm to 10-mm pathlength cuvettes
Part Number Description
• Excellent thermal accuracy and precision
• Available for selected UV-Vis spectrophotometers
and disposable vials
111-3610 Vial Holder, 5 mm
111-3620 Vial Holder, 8 mm
111-3630 Vial Holder, 12 mm
111-3640 Cuvette Holder, 1 cm
Notes: Spacers for short pathlength cuvettes are designed to work only with 1-cm
cuvette holder.
The PIKE Technologies UV-Vis Cell Temperature Control Accessory
is an excellent choice for analysis of liquid samples that require
precise temperature control. The accessory is well suited for
pharmaceutical, life science and general industrial applications.
Temperature range of the accessory is 5 °C to 130 °C with +/- 0.5%
accuracy. Heating and cooling is controlled by a built-in Peltier
device. The Peltier element provides for reproducible ramping
and for reaching target temperatures quickly and reliably. The
system is driven by a digital temperature controller – directly, or
via PC. Individual sample holders are designed to accommodate
standard 1-mm to 10-mm cuvettes (1-, 2- and 5-mm cuvettes require
use of spacers) and 5-, 8- and 12-mm glass vials. Sample holders are
pin positioned to ensure maximum reproducibility.
The complete Falcon UV-Vis configuration requires the accessory
base, vial or cuvette holder, and one of the available temperature
controllers. The Falcon accessory is compatible with a selected range
of UV-Vis spectrophotometers.
O ptions
Part Number Description
162-0205
Glass Vials, 5 mm, 5 x 42 mm OD (200 ea.)
162-0208
Glass Vials, 8 mm, 8 x 43 mm OD (200 ea.)
162-0212
Glass Vials, 12 mm, 12 x 32 mm OD (200 ea.)
162-0255
Falcon Quartz Cuvette, 1 cm
162-1201
Spacer for 1-mm Cuvette
162-1202
Spacer for 2-mm Cuvette
162-1205
Spacer for 5-mm Cuvette
170-1100
Liquid Recirculator
Note: Please see more cuvette options on page 140.
Specifications
Temperature Control
Temperature Range
5 °C to 130 °C
Accuracy
+/- 0.5%
Sensor Type
3 wire Pt RTD (low drift, high stability)
Temperature Controllers
PIKE Liquid
Recirculator
Peltier (cooling and heating)
Digital +/- 0.5% of set point
Digital PC+/- 0.5% of set point, graphical setup,
up to 20 ramps, USB interface
Input Voltage90–264 V, auto setting, external
power supply
Output Voltage
16 VDC/150 W maximum
Dimensions (W x D x H)89 x 121 x 83 mm
(without FTIR baseplate and mount)
Notes: Peltier device must be water-cooled for proper operation – this is achieved
by running cold tap water through the water jacket integrated into the accessory shell, or by the use of an external liquid circulator.
144
UV-Vis DiffusIR –
Highly Efficient Collection Optics for Maximum Sensitivity
Environmental Chamber
for the UV-Vis DiffusIR
Coupling the UV-Vis DiffusIR and environmental chambers
with the PIKE PC controlled temperature module and TempPRO™
software provides the ability to graphically set up the experiment
with up to 20 ramps and hold times.
UV-V is A ccessories
For advanced temperature studies, environmental chambers
are available and may be configured for temperatures from -150 °C to
1000 °C. Using the chamber’s porous ceramic sample cups, reaction
gases may be flowed through
the sample. All chambers are
compatible with the FT-IR/
NIR DiffusIR also.
Features
• Micrometer-controlled sample focus to optimize results for
every sample
• Optional environmental chambers for heating, cooling and
high-vacuum applications
• Quick-release feature of environmental chambers for easy
insertion and removal of sealed chambers
• Digital PC temperature controller option for programming
ramping rates and isothermal hold times
PIKE Technologies TempPRO software provides a graphical interface for
temperature control and kinetic measurements.
608-274-2721
Optical geometry of
the UV-Vis DiffusIR
www.piketech.com
Liquid nitrogen-cooled system and temperature control module.
Pike Technologies
PIKE Technologies introduces the UV-Vis DiffusIRTM diffuse reflectance
accessory for research and routine measurements. Powered optical
mirrors are diamond-turned aluminum for optimal performance and
reflectivity. The UV-Vis DiffusIR base is completely enclosed to shield
against external light. To avoid additional stray light from filtering
into the accessory, a magnetically-attached light shield is included
to cover the sample slide. The standard configuration offers a twoposition slide to accommodate reference and sample cups.
The heart of the UV-Vis DiffusIR is a unique monolithic
ellipsoidal reflector permanently fixed in place – eliminating the
need for repositioning the focus optics for sample placement.
The optical design efficiently collects diffuse radiation generated
from the sample. The sample Z-position can be optimized by
using the micrometer sample focusing adjustment. In this manner
the sensitivity of the accessory is maximized without sacrificing
precision. The UV-Vis DiffusIR comes equipped with a Sample
Preparation and Loading Kit.
145
Sophisticated Science
O r d e r i n g I n fo r m a t i o n
Part Number Description
R eplacement P arts and S upplies (cont.)
041-10XXX
Part Number Description
UV-Vis DiffusIR Accessory
Includes Sample Preparation Kit with 2 micro and 2 macro
sample cups, sample loading tools, alignment mirror, 35-mm
mortar with pestle and KBr powder (100 g)
Notes: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
O ptions
Part Number Description
160-1132
Disk, KBr, 32 x 3 mm
160-1113
Disk, ZnSe, 32 x 3 mm
160-1372
Disk, UV-Vis SiO2, 32 x 3 mm
160-5049
Disk, SiO2, 32 x 3 mm
160-5125
Disk, low OH SiO2, 32 x 3 mm
160-1143
Disk, CaF2, 32 x 3 mm
162-4210
O-Ring for UV-Vis DiffusIR chamber (10 ea.)
UV Vis DiffusIR Environmental Chamber, HTV,
ambient to 1000 °C
162-4215
O-Ring for UV-Vis DiffusIR chamber cooling line (10 ea.)
UV-Vis DiffusIR Environmental Chamber, LTV,
-150 to 500 °C
162-4251
Ceramic Cup for UV-Vis DiffusIR chamber, porous
162-4270
Alignment Mirror for UV-Vis DiffusIR chamber
162-4150
UV-Vis DiffusIR Environmental Chamber, HTV,
ambient to 500 °C
162-4200
162-4140
Notes: HTV and LTV chambers require the selection of a temperature control
module. UV-Vis DiffusIR chambers include front plate accommodating environmental
chamber (easily changeable with standard UV-Vis DiffusIR front plate), Pin-Loc
chamber insertion for easy sample exchange, KBr window, ceramic sampling
cups compatible with vacuum and reaction formats, ports and 2 shut-off valves for
vacuum operation and ports for connection of water cooling. Operation of the LTV
at sub-ambient temperatures requires PN 162-4160 Liquid Nitrogen-Cooled System
and Temperature Control Module, and rotary pump for vacuum insulation.
T emperature C ontrol M odules
Part Number Description
076-2450
PC Controlled Temperature Module, HTV Chambers
Includes digital temperature selection and TempPRO software
076-2250
Digital Temperature Control Module, HTV Chambers
162-4160 Liquid Nitrogen Cooled System and Temperature Control
Module, DiffusIR Environmental Chamber, LTV, -150 to 500 °C
Note: Please contact PIKE Technologies for items not described in this list.
Specifications
Optical Design
Angle of Incidence
30 degrees, nominal
Dimensions (W x D x H)102 x 225 x 201 mm (excluding light
guard tubes and baseplate)
Sample FocusMicrometer
Sample Positions2 positions, slide stops for background
and sample with no purge loss
Sample CupsMicro: 6 x 1.6 mm deep
Macro: 10 x 2.3 mm deep
Notes: PC controlled temperature module with TempPRO software provides a
graphical user interface for setting experiment parameters. Please contact PIKE for
PC compatibility. The temperature control modules for the HTV and LTV chambers
are not interchangeable.
Environmental Chamber Specifications
R eplacement P arts and S upplies
Temperature Range, HTV
Ambient to 500 or 1000 °C
Part Number Description
Temperature Range, LTV
-150 to 500 °C
170-1100
Liquid Recirculator
Accuracy
042-2010
Sample Cup, micro, 6-mm diameter, 1.6 mm deep (2 ea.)
042-2020Sample Cup, macro, 10-mm diameter, 2.3 mm deep (2 ea.)
Abrasion Sampling Kit
042-3020
Abrasion Disks, silicon carbide (100 ea.)
Temperature Control
Heating Rate, Maximum
Kinetic Setup (requires digital PC controller,
includes PIKE
TempPRO software)
Abrasion Disks, diamond (50 ea.)
042-3030
Sample Cup Holder and Base
160-8010
KBr Powder, 100 g
042-3040
Sample Preparation Kit
042-3060
Flat Sample Post
042-3080
Alignment Mirror
162-4303
Rotary Pump for vacuum insulation
+/- 0.5%
Input Voltage100–240 VAC (HTV version)
110/220 V switchable (LTV version)
042-3010
042-3025
Operating Voltage 28 VDC/84 W (HTV and LTV versions)
Digital or Digital PC
120 °C /min
• Up to 20 temperature ramps
• Individual ramp rate and hold
time settings
• Graphical display of experiment settings
• USB interface
Sensor
K Type (for HTV)
RTD Type, Pt100 (for LTV)
1 x 10-6 Torr (13 x 10-4 Pa)
Vacuum Achievable
Window Size32 x 3 mm disk
Leaking Rate
Sample Cup Size
146
3X ellipsoidal
< 6.0 x 10-11 Pa m3/sec
6.0-mm OD, 4.0-mm height
4.7-mm ID, 2.0-mm depth
Sample Cup DesignPorous ceramic compatible with powders and gas flow
Cooling Ports
Gas/Vacuum Ports
Quick-Fit, 6-mm ID
1/8” Swagelok®
UV-Vis Calcite Polarizers –
Manual and Automated Versions
UV-V is A ccessories
Glan-Taylor field of view
UV Glan-Thompson field of view
Features
• Glan-Taylor and UV Glan-Thompson designs
• High-grade calcite
• High extinction ratio
• Manual versions – 1 degree settable angular resolution
• Automated version – 0.5 degree angular resolution
• Fits in a standard 2 x 3 inch mount
Wavelength (nm)
300
400
> 500
25
40
65
85
Glan-Taylor
UV Glan-Thompson
MaterialCalcite
Spectral Range
250–2300 nm
Calcite
250–2300 nm
Clear Aperture
12 mm
14 mm
Extinction Ratio
5 x 10-5
1 x 10-4
Manual Polarizer 29 x 50 x 146 mm 49 x 50 x 146 mm
Dimensions (W x D x H)
Automated Polarizer 56 x 50 x 146 mm 56 x 50 x 146 mm
Dimensions (W x D x H)
Angular Resolution, Manual1°
Angular Resolution, Auto0.5°
1°
0.5°
O r d e r i n g I n fo r m a t i o n
Part Number Description
198-1623
Manual Glan-Taylor
198-1624
Manual UV Glan-Thompson
198-1625
Automated Glan-Taylor
198-1626
Automated UV Glan-Thompson
Note: Polarizers may not fit in the sample compartments of some smaller
spectrophotometers. The automated polarizers include the PIKE Technologies
Motion Control Unit and AutoPRO software for automated operation. Please consult
PIKE Technologies before placing an order or to inquire about spectrophotometer
slide mount holders.
608-274-2721
Each polarizer type has a different field of view where the
UV-Vis beam is polarized. The UV Glan-Thompson field of view is
wider compared to the Glan-Taylor as shown in the figure.
Enhanced angular resolution of 0.5° is gained with the
automated version of the PIKE UV-Vis polarizer. This automated feature
is advantageous where highly precise angular settings are required
and for increasing the measurement simplicity for determining the
polarized orientation of a sample. By evaluating the transmission
or reflectance of a sample as a function of the automated polarizer
angle at a given wavelength, parallel and perpendicular orientation
of the sample relative to the polarizer degree setting may be
determined. The automated version includes integrated data
collection with some commercial UV-Vis spectrophotometer
software packages.
www.piketech.com
Minimum Transmission (%)
250
Specifications
Pike Technologies
PIKE Technologies offers Glan-Taylor and Glan-Thompson UV-Vis
polarizers. These take advantage of the birefringent properties
of UV-quality calcite. An air interface is assembled between two
right angle calcite prisms in the Glan-Taylor polarizer whereas a
UV-transparent cement separates the calcite prisms in the GlanThompson polarizer. In both styles, the polarized extraordinary ray
passes through both prisms and the ordinary ray is internally
reflected and absorbed. The spectral range of these polarizers is
250–2300 nm. Due to the natural origin of calcite the achievable
minimum wavelength fluctuates from polarizer to polarizer.
However, at 250 nm the transmission throughput is no less
than 25%.
The sample material and sampling configuration dictate the need
for a UV-Vis polarizer. Typical materials that may require a polarizer
during sampling are often crystals, films, paints, beam splitters,
coated glass, and anti-reflective, and anti-glare coatings. Additionally,
we recommend using a polarizer for specular reflectance sampling at
an angle of incidence greater than 15 degrees where the reflectivity
becomes polarization dependent.
147
Wavelength (nm)
Specifications
Substrate
Fused Silica
Performance Range
UV, Ultra Contrast
Vis/NIR
Element Diameter
25 mm
Clear Aperture
19 mm
240–400 nm
300–3200 nm
Dimensions (W x D x H)
Manual
Precision
Automated
50 x 86 x 17 mm
50 x 146 x 17 mm
50 x 146 x 55 mm
UV Ultra-Contrast Polarizer performance data
Contrast
• Thin profile
• Large acceptance angle, up to 20 degrees
• High transmission and high contrast choices
• Manual and automated versions
PIKE Technologies introduces an innovative new line of highcontrast polarizers covering the UV region and the Vis to NIR region.
Using nanofabricating techniques, wire grid lines at a 100-nm pitch
are etched on fused silica or glass substrate resulting in a highperformance polarizer. Compared to a traditional calcite polarizer, the
large acceptance angle of the nanowire grid polarizer, greater than
20 degrees, eases alignment concerns during use. Additionally, the
compact size makes these polarizers ideal for use in confined spaces.
The element diameter is 25 mm and has a clear aperture of 19 mm.
The polarizer fits a 2 x 3 inch slide mount.
Transmission and contrast ratio of the UV ultra contrast and the
broadband polarizers are shown in the next column. Contrast ratio
greater than 10,000:1 may be found, making these high-performance
polarizers a competitive alternative to calcite polarizers.
There are two manual polarizer types available. The short
form has 5 degree scale resolution and the long form has scale
resolution of 1 degree. The automated precision polarizers are fully
computer controlled and offer the added benefit of increased setting
reproducibility with accuracy of +/- 0.5 degree. With automated
polarizers an analysis program can be set up through PIKE AutoPRO
software, and includes data collection with some spectrophotometer
software packages.
148
Contrast
P-Transmission (%)
Features
P-Transmission (%)
Sophisticated Science
UV-Vis Nanowire Grid Polarizers –
Manual and Automated Versions
Wavelength (nm)
Broadband Polarizer performance data
O r d e r i n g I n fo r m a t i o n
Part Number Description
190-2010 Precision UV Polarizer, Ultra Contrast
190-2012
Manual UV Polarizer, Ultra Contrast
190-2015
Precision UV Polarizer, Ultra Contrast, Automated
190-2020
Precision Vis/NIR Broadband Polarizer, High Contrast
190-2022
Manual Vis/NIR Broadband Polarizer, High Contrast
190-2025
Precision Vis/NIR Broadband Polarizer, High Contrast,
Automated
Notes: The element diameter is 25 mm. Contact PIKE for 15-mm diameter options.
Polarizers may not fit in the sample compartments of some smaller spectrophotometers. The automated polarizers include the PIKE Technologies Motion
Control Unit and AutoPRO software for automated operation. Please consult PIKE
Technologies before placing an order or to inquire about spectrophotometer slide
mount holders.
UV-Vis Spec –
Slide Mounted Specular Reflectance Accessories
UV-V is A ccessories
PIKE Technologies relative fixed angle specular reflectance
accessories for UV-Vis spectrophotometers span from near-normal
to grazing angle. This product sheet highlights our specular
reflectance accessories featuring slide mount design. These cover
mid-range angles of incidence, between 15–60°, and may be
aligned to maximize throughput.
In specular reflectance sampling, the light source is directed to
contact the sample at a given angle of incidence. Measured light
is collected from the equivalent angle. Typical samples include
semiconductors, anti-reflective coatings, color filters, semi-transparent and highly reflective mirrors, optical materials, reflection
filters, multiple layers, solar mirrors and solar controlling films
on glass. Measured parameters of interest include film thickness,
material reflectivity, and coating uniformity and homogeneity.
Features
• Fixed angle reflectance accessories including
15, 20, 30, 45 and 60 degrees
• Slide mount design for easy installation
• Optical and anti-reflective coatings testing
• Gloss measurements
• Determining reflectivity of mirrors
• Film thickness calculations
Specifications
Mounting Method
Accessory Dimensions
Slide Mount (W x D x H)
Mask Aperture
4 mm x 7 mm
Optical Mirrors
UV-optimized aluminum
Slide mount
95 x 51 x 76 mm
F ixed A ngle S pecular R eflectance A ccessories
Part Number Description
UV-Vis 15Spec
121-2000
UV-Vis 20Spec
121-3000
UV-Vis 30Spec
121-4500
UV-Vis 45Spec
121-6000
UV-Vis 60Spec
300-0300
UV Aluminum Mirror (25.4 mm x 25.4 mm)
121-0500
Aperture Mask (4 mm x 7 mm)
Note: Please contact PIKE Technologies to inquire about spectrophotometer sample
compartment slide mounts.
608-274-2721
121-1500
www.piketech.com
O r d e r i n g I n fo r m a t i o n
Optical geometry schematic for mid-range fixed angle
specular reflectance accessory.
Pike Technologies
Anti-reflective optics coating spectrum collected using the PIKE
UV-Vis 60Spec.
149
UV-Vis 10Spec –
Near-normal Sample Reflectivity Measurements
Sophisticated Science
The PIKE Technologies UV-Vis 10Spec is an optimized specular
reflectance accessory designed to make high-performance
measurements of sample reflectivity. The UV-Vis 10Spec produces
a collimated beam to illuminate the sample area such that the
reflectivity measurement is uniformly 10 degrees and not an average
of angles produced by a focused beam accessory design. This
accessory fits most research-grade spectrophotometers.
The UV-Vis 10Spec may also be used to measure near-normal
reflectivity of a wide variety of surfaces including military devices,
reflecting optics, anti-reflective (AR) coated surfaces, and other
reflecting and non-reflecting materials.
Features
• Measure sample reflectance
• Fixed 10 degree angle of incidence
• Sample illumination using collimated beam precisely fixed
at 10 degrees
• Sampling mask sizes of 7, 13 and 25 mm x 4 mm
• Baseplate mount design for stable operation and collection
of high-quality spectra
FTIR spectra measuring the reflectively of SiO2 coated aluminum mirror
with the UV-Vis 10Spec.
O r d e r i n g I n fo r m a t i o n
Part Number Description
010-10XXX
UV-Vis 10Spec – 10 Degree Specular Reflectance Accessory
Includes 3 sample masks (7, 13 and 25 mm x 4 mm),
aluminum alignment mirror and base mount
Note: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
R eplacement P arts and S ampling O ptions
Part Number Description
013-4015
Aperture Mask Set, 7, 13, 25 mm x 4 mm
300-0300
UV-Aluminum Mirror, 25.4 mm x 25.4 mm
Beam path within the UV-Vis 10Spec specular reflectance accessory.
Specifications
Optics
All reflective
Angle of Incidence 10 degrees
Sample Masks
7, 13 and 25 x 4 mm
Purge Sealing
Purge tubes and purge barb included
Dimensions (W x D x H)
150
149 x 88 x 118 mm
(excludes baseplate)
UV-Vis 85Spec –
Specular Reflectance Accessory
Specifications
F e a t u r e s a n d A pp l i c a t i o n s
• Small footprint, compact design
• Fixed 85-degree angle of incidence
• Baseplate mount for stable operation and collection of
UV-V is A ccessories
AR-coated ZnSe crystal measured using the 85Spec specular
reflectance accessory.
Angle of Incidence 85 degrees
Mounting MethodBaseplate
Dimensions (W x D x H)
Mask Aperture
35 x 3 mm
Optical Mirrors
UV-optimized aluminum
105 x 84 x 76 mm
high-quality spectra
• Thin film and coating measurements
O r d e r i n g I n fo r m a t i o n
Part Number Description
Note: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
R eplacement P arts
Part Number Description
Aperture Mask (35 mm x 3 mm)
608-274-2721
The 85Spec is an 85-degree specular reflectance accessory
developed for UV-Vis applications. The accessory is used to analyze
mirror-like planar surfaces and thin films on planar surfaces.
The grazing angle measurements give the longest possible
pathlength through coated samples.
Pre-mounted on a baseplate specific to your UV-Vis
spectrophotometer, the 85Spec is an easy-to-use accessory.
The mounting allows the 85Spec to be inserted and removed
from the sample compartment without alignment.
UV-Aluminum Mirror (38.1 mm x 38.1 mm)
121-0501
www.piketech.com
Optical diagram of the UV-Vis 85Spec specular reflectance accessory.
300-0301
Pike Technologies
121-85XXX
UV-Vis 85Spec – 85 Degree Specular Reflectance Accessory
Includes an Al substrate alignment mirror and sample mask
151
Sophisticated Science
UV-Vis VeeMAX –
Variable Angle Specular Reflectance Accessory
This flexibility allows for optimization of spectral quality for film and
coating measurements. In other applications where it is desirable to
study the effect of incident angle upon reflected radiation, the
UV-Vis VeeMAX offers a sampling solution. For samples such as
reflectors, bandpass filters, and hot and cold mirrors. The UV-Vis
VeeMAX makes an ideal accessory used to replicate real-world
situations such as the effect of a rising and setting sun on absorbance
efficiency of solar collectors and architectural glass performance.
F e a t u r e s a n d A pp l i c a t i o n s
• Selectable angle of incidence – from 30 to 80 degrees in
one degree increments
• Film and coating thickness measurements at optimized
angle of incidence
• Grazing angle measurements for the longest path through
ultra-thin films
• Characterization of variable reflectivity materials
Specular reflectance collected at two different angles of incidence for an
anti-reflective coating.
Specifications
Optical geometry schematic for UV-Vis VeeMAX
variable angle specular reflectance accessory.
Angle of Incidence 30–80 degrees
Mounting MethodBaseplate
Nominal Accessory Dimensions (W x D x H) (dimensions vary
with spectrophotometer type)
145 x 135 x 158 mm
50 mm
Minimum Beam Height
Mask Aperture7 mm x 4 mm
13 mm x 4 mm
25 mm x 4 mm
Optical Mirrors
UV-optimized aluminum
O r d e r i n g I n fo r m a t i o n
Part Number Description
In specular reflectance sampling, the light source is directed to
contact the sample at a given angle of incidence. Measured light
is collected from the equivalent angle. Typical samples include
semiconductors, anti-reflective coatings, spectral wavelength filters,
semi-transparent and highly reflective mirrors, optical materials,
reflection filters, multiple layers, solar mirrors, and solar controlling
films on glass. Measured parameters of interest include film thickness,
material reflectivity, and coating uniformity and homogeneity.
With the UV-Vis VeeMAX™ accessory find versatility for specular
reflectance measurements. The angle of incidence from 30 degrees
to 80 degrees is easily changed by turning the angle setting dial.
152
013-10XXX
UV-­Vis VeeMAX Variable Angle Specular Reflectance Accessory
Includes masks and aluminum mirror
Note: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
R eplacement P arts
Part Number Description
300-0300
UV Aluminum Mirror (25.4 mm x 25.4 mm)
013-4015
Aperture Mask Set (7, 13 and 25 mm x 4 mm)
Out-of-Compartment Microplate Reader –
Plate Reading Option for UV-Vis Spectrophotometers
Features
• Microplate reading option for standard UV-Vis ­­
spectrophotometers
• Scanning and fixed wavelength measurements
(spectrophotometer dependent)
• On-board detector
• 6-well to 384-well microplate reading capability
• Custom configurations for automated sampling
• CD-style loading for autoloader interface
Optics1
Transfer optics module, optical fiber
probe and photodiode detector
+/- 25 µm
Accuracy1
Mechanical Specifications
Repeatability 1 +/- 5 µm
Resolution1
Run Time1
Computer Interface1
Power Requirements1
Dimensions (W x D x H)1
Weight1
1 µm
9 6-well plate – 32 seconds
384-well plate – 84 seconds
USB
100–240 Volts AC 50/60 Hz
11.6 x 13.7 x 6”
15 lbs
O r d e r i n g I n fo r m a t i o n
Part Number Description
047-10XXX
Microplate Reader Accessory
Note: Replace XXX with your spectrophotometer’s Instrument Code. Click for List >
O ption
Pike Technologies
Part Number Description
162-1910
96-Well Polystyrene Sample Plate
R equired O ptical
photodiode detector)
C omponents (must select fiber optic probe and
Part Number Description
047-3011
Photodiode Detector, Cary 50/60
047-3030
Optical Fiber Probe
Note: Contact PIKE Technologies to verify that the accessory is compatible with
your spectrophotometer. Requires fiber optic launch optics or fiber couple from
spectrophotometer manufacturer.
www.piketech.com
The PIKE Technologies Out-of-Compartment Microplate Reader is
a unique option available for UV-Vis spectrophotometers. It offers
high throughput plate reading capability to a wide range of
traditional instruments with standard sample compartments. This
allows for flexibility when conducting experiments that require
optical configuration for cuvettes, temperature control, integrating
spheres (among others) and extra microplate reading functionality
when needed. Microplate reading capability is often required in
research, drug discovery, bioassay validation, quality control and
manufacturing processes in the pharmaceutical and biotechnological
industry and academia. The PIKE Microplate Reader can also be
adapted to perform automated measurements of filters, optical
components and other materials.
The Microplate Reader module features a small footprint
and can be positioned next to or above the spectrophotometer.
Using a fiber coupler in the sample compartment, the light is sent
to the accessory via a single optical fiber probe and collected by an
on-board photodiode detector.
The mechanical design of the accessory relies on an X, Y stage
with both axes driven by high-precision servo motors with optical
encoders for speed and reproducibility. USB and DC power are the
only external connections required for this accessory.
Programming and control of the Microplate Reader is done
through PIKE Technologies AutoPRO software, which can be
integrated easily with many third-party UV-Vis software packages.
Specifications
UV-V is A ccessories
AutoPRO Software – Microplate Reader configuration screen.
608-274-2721
153
Automated Transmission R-Theta Rotational Stages
for UV-Vis Spectrophotometers
Sophisticated Science
The operation is managed by PIKE AutoPRO™ software which
provides full user programmability and an easy to learn “pointand-click” environment. Polar or X and Y coordinates may be used
to define test points. The AutoPRO software allows complex test
sequences to be set up, stored as methods and implemented for
full flexibility. Each automated accessory is tailored to meet specific
sampling needs. This includes adjustments for sample shape/size,
and the type of spectroscopic data required. Please contact PIKE
Technologies to verify that the selected stage can be integrated into
your spectrophotometer’s sample compartment and for custom
sample inserts.
Features
• R-theta motion mapping optical samples
• Complete hardware and software interface package for
automated, multi-position measurements
• Light-tight enclosure included
• Custom inserts available
AutoPRO software configured for the Vertical Transmission Accessory.
PIKE Technologies’ vertical R-theta computer controlled accessories
for translating and rotating samples in the spectrophotometer beam.
These tools enable transmission mapping of sample surfaces and
generating spectroscopy data as a function of sample position. Suitable
for determination of film and coating thickness, multilayer film
analysis, reflectivity studies and characterization of optical materials.
Using the standard sample wheel and custom inserts, these
accessories are suitable for analyzing small and large size samples
including coated and uncoated glass, optical filters, solar panels
and similar materials. Support ring mounts on the accessory’s drive
and is rotated and translated laterally to produce an R-theta motion
covering the entire sampling range of the accessory. Each system
incorporates two precision stepper motors for the plate movement.
O r d e r i n g I n fo r m a t i o n
Part Number Description
073-4011
Vertical 12 inch Transmission Accessory –
Cary 5000/6000
Includes vertical mapping stage with light enclosure,
motor controller
073-5100
Vertical 12 inch Transmission Accessory –
Lambda 750/850/950/1050
Includes vertical mapping stage with light enclosure,
motor controller
073- 5011 Vertical 8 inch Transmission Accessory –
Cary 5000/6000
Includes vertical mapping stage with light enclosure,
motor controller
073-5010
Vertical 8 inch Transmission Accessory –
Cary 500/500
Includes vertical mapping stage with light enclosure,
motor controller
Note: For sizes not listed here or custom inserts, please contact PIKE Technologies.
Ask about X, Y movement accessories and horizontal stages.
154
Standards, Software
and D atabases
We strive to provide you with useful sampling tools for
spectroscopy and offer these additional products and
information to serve your laboratory requirements. If you
have not found the ideal sampling tool, please contact us. Your
spectroscopy sampling requirements may become one of our
product offerings in the future.
Reference Standards Page 156
For calibrating your spectrometer
PIKECalc™ Page 159
For FTIR sampling computations
Spectral Databases Page 160
ATR and transmission versions for your FTIR
PIKE T echnologies , I nc ., 6125 C ottonwood D rive , M adison , WI 53719
(608) 274-2721 . www . piketech . com . sales @ piketech . com
Calibrate, Compute and Compare
Reference Standards –
For Calibrating FTIR Spectrometers
Features
• Mid-IR and NIR spectral regions products
• Transmission, reflection and ATR versions
• Traceable versions available
FTIR spectrometers are highly accurate and reliable measurement
tools. Their internal referencing laser (Connes advantage) is a great
leap forward in wavenumber accuracy and repeatability. Still, it is
often required by regulatory agencies and operating procedures to
calibrate the spectrometer. PIKE Technologies offers several new
products to assist in this task
PIKE Technologies offers several versions of polystyrene
reference materials for FTIR spectrometer calibration. The 1.5
mil and 55 micron thick polystyrene are generally specified for
calibrating wavenumber accuracy. A NIST traceable polystyrene
version of these products is available which includes the reference
material, calibration result for the material and its traceability
documentation.
Polystyrene Reference
Standards – for calibrating
FTIR wavenumber accuracy
Polystyrene Reference Standard spectrum.
To evaluate FTIR instrument photometric linearity, PIKE offers
the NG11 Reference Standard traceable to National Research
Council of Canada. The traceability documentation included shows
transmission values at seven band assignments. The range covered is
4000 to 2000 cm-1. The NG11 element comes mounted in a standard
2 x 3 inch slide.
NG11 Reference Standard spectrum.
NG11 Linearity Reference Standard
156
Diffuse Gold
Reference Standard
Measured reflectivity of Diffuse Gold Reference Standard.
Diffuse reflectance sampling in the mid-infrared region is used
to measure the reflectance of powders, films, painted panels and
other samples. Exhibiting sharp peaks throughout the mid-IR
spectral region, the Mid-IR Diffuse Reflectance Wavelength
Standard is used to verify and calibrate for wavelength accuracy
or diffuse reflectance measurements. This standard is NIST traceable
to NIST 1921b and an analysis
certificate is included.
Mid-IR Diffuse Reflectance Standard spectrum.
Red trace: Theoretical 0o
reflectance of a single
germanium surface
Specular Reflectance Standard –
for calibrating reflectance
measurement system
Comparison of measured and calculated reflectance for the Specular
Reflectance Standard using the PIKE 10Spec accessory.
608-274-2721
Blue trace: Measured 10o
reflectance of Single Surface
Reflectance Standard
www.piketech.com
The Specular Reflectance Standard is a unique material for
calibration of your reflectance measurement system. The standard is
a specially treated germanium element which only allows reflection
from its front surface – thereby providing a reflection value which
can be calculated relative to Fresnel equations.
The Specular Reflectance Standard includes documentation to
trace the specular reflectance to published refractive index data. It is
compatible with the following PIKE Technologies specular reflectance
accessories: VeeMAX III, 10Spec, 30Spec, 45Spec and 80Spec.
Pike Technologies
Mid-IR Diffuse Reflectance
Wavelength Standard
S tandards , S oftware and D atabases
For diffuse reflectance measurements in the NIR and UV-Visible
spectral region, it is often desirable to measure against the highest
possible reflectance material. NIR and UV-Vis Diffuse Reflectance
Standards are available in highly reflective diffuse gold and PTFE.
Each standard is certified to a National
Research Council of Canada
traceable plaque standard.
157
Calibrate, Compute and Compare
In the near infrared (NIR) spectral region, PIKE Technologies
offers its NIR Wavelength Standard for calibrating a NIR
spectrometer. The NIR Wavelength Standard meets USP wavelength
requirements, provides calibration beyond 2.0 µm and is NIST
traceable. This standard is compatible with NIR analysis in the
diffuse reflectance sampling mode. The
NIR Wavelength Standard includes
analysis certificate and traceability
documentation.
NIR Wavelength
Standard
NIR Wavelength Standard spectral data. PIKE NIR Wavelength Standard
(upper green spectrum), NIR standard from another supplier (lower red
spectrum).
ATR spectra are somewhat different than those produced by
transmission sampling techniques – both in relative intensity of
the absorbance bands and also the position of the bands. To assist
with calibrating your ATR/FTIR system, PIKE Technologies offers an
ATR Reference Standard. The ATR Reference Standard
is available as a standard material and
also in a version which includes
a recommended validation
procedure for your
ATR/FTIR system.
ATR Reference
Standard
ATR Reference Standard spectrum.
O r d e r i n g I n fo r m a t i o n
P olystyrene R eference S tandards
Mid-IR Diffuse Reflectance Standards
Part Number Description
Part Number Description
162-5450
NIST Traceable Polystyrene Reference Standard, 1.5 mil
162-5420
Polystyrene Reference Standard, 1.5 mil (38 micron)
162-5485
Mid-IR Diffuse Reflectance Wavelength Standard,
1.75” optical diameter
162-5440
Polystyrene Reference Standard, 2.2 mil (55 micron)
162-5486
Mid-IR Diffuse Reflectance Wavelength Recertification
Note: Polystyrene reference standards are mounted in a 2” x 3” card and are
compatible with all FTIR spectrometers.
ATR R eference S tandard
Part Number Description
NG11 L inearity R eference S tandard
Part Number Description
162-5490
NG11 Transmission Standard
162-5470
162-5476 S pecular R eflectance S tandard
Part Number Description
162-5460
Specular Reflectance Standard
Note: Compatible with 10Spec, 30Spec, 45Spec, 80Spec and VeeMAX III accessories.
158
ATR Reference Standard
162-5475ATR Reference Standard with Recommended Validation
Procedure and Validation Certificate
ATR Reference Standard Recertification
Note: Compatible with MIRacle, GladiATR and VeeMAX III with ATR accessories.
NIR W avelength S tandard
Part Number Description
048-3070
Traceable NIR Reference Standard, 0.9” optical diameter
NIR and UV-V is D iffuse R eflectance S tandards
048-3071
Traceable NIR Reference Standard Recertification
Part Number Description
Note: Includes traceability measurement documentation.
162-5480
Diffuse PTFE Reference, 0.9” optical diameter
162-5481
Diffuse Gold Reference, 0.9” optical diameter
162-5482
Diffuse Gold Reference, 1.7” optical diameter
Features
• Convert from wavelength (micron and nanometer)
to wavenumber
• Calculate depth of penetration, critical angle, effective
pathlength, effective angle of incidence and number of
reflections for ATR
• Calculate cell pathlength, thickness of free-standing film
To activate our free on-line interactive Crystal Properties
program and FTIR Calculator, select a gold button on the homepage
of our website: www.piketech.com. The FTIR Calculator allows
for wavelength to wavenumber conversion, pathlength and
film thickness determination, and ATR
calculations. Refer to our Crystal Properties
program to choose the best crystal to use
for your application.
and thickness of coating
• FREE access online at www.piketech.com
PIKECalc software is easy to use – just select the type of computation,
enter values from your spectral data and click on the calculate
button. An instant calculation is performed.
PIKECalc eliminates the need to search through literature
references to find the correct conversions and formulae and gives
you immediate results. All formulae and equations are documented
in the software, if you wish to reference our mathematics. Help
and how to use PIKECalc is included within the software.
Please ask us about other FTIR spectroscopy calculations you
may need.
S tandards , S oftware and D atabases
PIKECalc Software –
For FTIR Sampling Computations
Crystal Properties program available online.
Pike Technologies
O r d e r i n g I n fo r m a t i o n
www.piketech.com
Conversions function of the online FTIR Calculator.
Part Number Description
PIKECalc Software on CD
Notes: PIKECalc is loaded on a CD disk for upload to your PC and operates with
current versions of Microsoft operating systems.
608-274-2721
007-0300
159
Calibrate, Compute and Compare
ATR Spectral Databases –
Optimize Search Results for ATR Spectral Data
O r d e r i n g I n fo r m a t i o n
ATR S pectral D atabases
Part Number Description
Aldrich ATR Spectral Database (18,513 spectra)
008-2000
IChem ATR Spectral Database (13,557 spectra)
008-3000
Aldrich-IChem ATR Spectral Database Package (40,810 spectra)
Notes: The spectral databases include a USB-based device – dongle for copy
protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format.
ATR A pplication S pecific S pectral D atabases
Part Number Description
008-3002ATR Applications – Polymers and Polymer Additives
(7,970 spectra)
008-3003
ATR Applications – Food Additives and Food Packaging
(4,239 spectra)
• Select from databases with over 40,000 ATR spectra
• All spectra collected using FTIR spectrometers and a single
008-3004
ATR Applications – Solvents (1,313 spectra)
008-3005
ATR Applications – Organometallics and Inorganics
(2,125 spectra)
• Complete collections and applications databases available
• Compatible with most FTIR software
008-3006
ATR Applications – Biochemicals (7,529 spectra)
008-3007
ATR Applications – Aldehydes and Ketones (5,162 spectra)
008-3008
ATR Applications – Alcohols and Phenols (3,700 spectra)
008-3009
ATR Applications – Esters and Lactones (8,326 spectra)
008-3010
ATR Applications – Hydrocarbons (1,141 spectra)
008-3011
ATR Applications – Flavors, Fragrances and Cosmetic
Ingredients (4,060 spectra)
008-3012
ATR Applications – Pesticides (3,211 spectra)
008-3013
ATR Applications – Semiconductor Chemicals (1,379 spectra)
008-3014
ATR Applications – Forensic (3,770 spectra)
008-3015
ATR Applications – Dyes, Pigments and Stains (3,561 spectra)
Features
reflection ATR
Spectral search is greatly improved when using databases collected
using the same sampling mode – especially when the sampling
mode is ATR. PIKE Technologies offers a large selection of ATR
spectral databases.
The Aldrich ATR Spectral Database contains 18,513 spectra
produced by the Aldrich Chemical Company. The collection includes
organic and inorganic compounds and also includes polymers and
industrial chemicals. Spectral range is 4000–650 cm-1.
The IChem ATR Spectral Database contains 13,557 spectra
produced by Fine Chemical manufacturers in Japan. This collection
includes organic and inorganic compounds, basic polymers and
industrial chemicals. Spectral range is 4000–650 cm-1.
The Aldrich-IChem ATR Spectral Database Package includes
40,810 spectra, a combination of all ATR spectra from both
databases – with no duplicate entries.
A wide variety of applications spectral database packages are
formed from the Aldrich ATR and the IChem ATR databases.
These spectral databases are compatible with ABB Horizon
MB™, ACD/Labs, Bruker Opus, Jasco Spectra Manager™ Suite, Lumex
SpectraLUM/Pro®, PerkinElmer Spectrum 10™, WinFirst™, Shimadzu
IRSolution and HyperIR, LabControl SPECTACLE, Thermo Scientific
OMNIC™, Varian Resolutions Pro™, GRAMS and Spectral ID software
packages and more. A USB port is required on your PC where a
dongle is installed for copy protection.
160
008-1000
008-3016ATR Applications – Sulfur and Phosphorus Compounds
(5,655 spectra)
008-3017
ATR Applications – Hazardous Chemicals (6,698 spectra)
008-3018ATR Applications – Hazardous and Toxic Chemicals
(4,022 spectra)
008-3020
ATR Applications – Pharmaceuticals, Drugs and Antibiotics
(4,796 spectra)
008-3021ATR Applications – High Production Volume (HPV) Chemicals
(2,032 spectra)
008-3025
ATR Applications – Coatings (2,433 spectra)
008-3026
ATR Applications – Paints (3,426 spectra)
Notes: The spectral databases include a USB-based device – dongle for copy
protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format. Specify
your FTIR software for correct format. Due to new additions or revisions to
databases, spectral quantities may fluctuate. Please call for exact specifications at
time of order.
O r d e r i n g I n fo r m a t i o n
T ransmission S pectral D atabases
Part Number Description
008-4001
SDBS Transmission by KBr Pellet Spectral Database
(22,995 spectra)
008-4004SDBS Transmission by Liquid Film Spectral Database
(7,018 spectra)
008-4005
SDBS Transmission by Nujol Mull Spectral Database
(21,127 spectra)
Notes: The spectral databases include a USB based device – dongle for copy
protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format.
A pplication B ased S pectral D atabases
Part Number Description
Features
• Select from databases with over 50,000 transmission spectra
• All spectra collected using FTIR spectrometers and
transmission sampling mode
• Complete collections and applications databases available
• Compatible with most FTIR software
008-5002
008-5003Transmission Applications – Food Additives and Food
Packaging (1,684 spectra)
008-5004
Transmission Applications – Solvents (668 spectra)
008-5005Transmission Applications – Organometallics and Inorganics
(1,445 spectra)
008-5006
Transmission Applications – Biochemicals (4,590 spectra)
008-5007Transmission Applications – Aldehydes and Ketones
(4,226 spectra)
008-5008
Transmission Applications – Alcohols and Phenols
(2,744 spectra)
008-5009Transmission Applications – Esters and Lactones
(4,335 spectra)
008-5010
Transmission Applications – Hydrocarbons (1,417 spectra)
008-5011Transmission Applications – Flavors, Fragrances and
Cosmetic Ingredients (1,912 spectra)
008-5012
Transmission Applications – Pesticides (958 spectra)
008-5013Transmission Applications – Semiconductor Chemicals
(664 spectra)
008-5014
Transmission Applications – Forensic (1,555 spectra)
008-5015Transmission Applications – Dyes, Pigments and Stains
(1,473 spectra)
008-5017Transmission Applications – Hazardous Chemicals
(2,664 spectra)
008-5018
Transmission Applications – Toxic Chemicals
(6,604 spectra)
008-5020Transmission Applications – Pharmaceuticals, Drugs and
Antibiotics (2,806 spectra)
Transmission Applications – High Production Volume (HPV)
Chemicals (1,123 spectra)
008-70051
Transmission Applications – Kidney Stones (1,668 spectra)
Notes: The spectral databases include a USB-based device – dongle for copy
protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format. Specify
your FTIR software for correct format. Due to new additions or revisions to
databases, spectral quantities may fluctuate. Please call for exact specifications at
time of order.
608-274-2721
008-5021
www.piketech.com
008-5016Transmission Applications – Sulfur and Phosphorus
Compounds (5,025 spectra)
Pike Technologies
PIKE Technologies offers a large collection of high-quality, spectral
databases collected in the transmission sampling mode.
The SDBS Transmission Spectral Databases include over 50,000
spectra produced by Fine Chemical manufacturers in Japan. All
spectra were collected at the Japanese National Laboratories under
highly controlled conditions with secondary verification of the
materials by NMR and MS. Data is measured using several sample
preparation methods. Spectral range is 4000–400 cm-1.
The SDBS Transmission by KBr Pellet Spectral Database
contains 22,995 spectra. This collection includes organic and
inorganic compounds, basic polymers and industrial chemicals.
The SDBS Transmission by Liquid Film Spectral Database
contains 7,018 spectra. This collection includes organic compounds
and industrial chemicals.
The SDBS Transmission by Nujol Mull Spectral Database
contains 21,127 spectra. This collection includes organic and
inorganic compounds and industrial chemicals.
A wide variety of applications spectral database packages are
formed from the KBr Pellet and Liquid Film Spectral Databases.
These spectral databases are compatible with ABB Horizon
MB™, ACD/Labs, Bruker Opus, Jasco Spectra Manager™ Suite, Lumex
SpectraLUM/Pro®, PerkinElmer Spectrum 10™, WinFirst™, Shimadzu
IRSolution and HyperIR, LabControl SPECTACLE, Thermo Scientific
OMNIC™, Varian Resolutions Pro™, GRAMS and Spectral ID software
packages and more. A USB port is required on your PC where a
dongle is installed for copy protection.
Transmission Applications – Polymers and Polymer Additives
(1,273 spectra)
S tandards , S oftware and D atabases
Transmission Spectral Databases –
High-Quality Spectral Data for Optimized Search Results
161
O rdering T erms , C ontact I nformation and G uarantee
Part Numbers and Price
The PIKE price list includes accessories that may be used with
a variety of makes and models of spectrometers. Please specify
the part number and description when ordering, including
your instrument type and model number. Click here for a list of
spectrometer and spectrophotometer instrument codes. When placing
an order, substitute these codes for the final two digits (XX) in the
accessory part number.
PIKE Technologies is continually extending the accessory
product range. If you are unable to find a required item, please
contact us to discuss your needs. We will be glad to assist.
Payment Terms
Purchase Order Number, cash in advance, MasterCard and Visa
are acceptable. Payment is net 30 days, and shipments are FOB
Madison, WI USA. Freight charges are prepaid and added to your
invoice. If you wish to pay freight charges, please specify this on
your order. Prepayment is required for international customers.
International Handling Fee
For orders placed from outside the United States or Canada,
a handling fee of $40 will apply per order to cover the costs
associated with the additional documentation and bank charges
required for international shipments.
Ways to Order
Many products are available for purchase directly through our
website. These items are marked on our website with a red
shopping cart icon.
Please include the following information when placing an
order: your name, phone number, product part number, quantity,
ship to address, bill to address, purchase order number and
spectrometer model on which the accessory will be used.
Orders may be placed via mail, phone, fax, e-mail or on our
website. We accept Visa and Mastercard via phone and direct
online purchases. For security purposes, do not send credit card
information via e-mail. An electronic order form is available on our
website (for P.O. Numbers only – do not use this form for credit
card orders). There is no minimum order requirement. Please use
the following addresses and phone/fax numbers when placing
your orders:
PIKE Technologies, Inc.
6125 Cottonwood Drive
Madison, WI 53719
(608) 274-2721 (TEL)
(608) 274-0103 (FAX)
[email protected] (E-MAIL)
www.piketech.com
Delivery
The delivery/shipment date is confirmed upon receipt of an
order. Special requirements and custom accessories are subject to
different lead times. Please contact us for price quotes and delivery
information on these products.
Guarantee
All PIKE products are guaranteed to be free from defects in material
and workmanship for a period of 12 months from the date of
shipment. Should you be dissatisfied, or have any queries, please
contact us immediately and we will promptly repair or replace the
product at no charge.
Product Returns
Please contact PIKE to receive your Return Material Authorization (RMA)
number if you wish to return any of our products. A restocking fee
may apply. Customers are responsible for shipping charges for all
returned products. For products under warranty, back-to-customer
shipping charges will be covered by PIKE. Please do not return any
products without obtaining the RMA number first.
T e c hn i c a l A s s i s t a n c e
PIKE Technologies offers comprehensive technical assistance. Please
contact us via mail, phone, fax or e-mail with your questions.
International Distribution
PIKE Products are available worldwide. Call or send us an
e-mail and we will provide you with an address of the sales
office closest to your location. All exports are handled in
accordance with the US Export Administration Regulations.
PIKE on the Web
Visit our web site to find out more information about new products,
up-to-date PIKE news, pricing, and to see the latest copy of the PIKE
Reflections Newsletter! www.piketech.com • [email protected]
Customer satisfaction is very important to all of us here at
PIKE Technologies, Inc. We have hopefully made the ordering
process very fast and easy for you. If you have any questions or
concerns about our products or services, please don’t hesitate to
contact us. We will be happy to make adjustments to fit your needs.
Products and prices are subject to change without notification.
©2017 PIKE Technologies, Inc.
Horizon MB™ belongs to ABB; Luer-Lok™ belongs to Becton Dickenson; Equinox™, IFS™, Quick-Lock™, Tensor™, Vector and Vertex™ belongs to
Bruker Optics Inc.; CAB-O-SIL® belongs to Cabot Corporation; Pyrex® belongs to Corning Glass Works; Delrin®, Kalrez®, Teflon®, and Viton® belong to
E.I. du Pont de Nemours and Company; Interspec belongs to Interspectrum OU; Spectra Manager™ belongs to Jasco, Inc; Winspec™ belongs to JEOL;
EMCOMPRESS® belongs to JRS Pharma; InfraLUM® and SpectraLUM/Pro® belongs to Lumex Ltd; Visual BASIC™ and Windows belongs to Microsoft
Corporation; Fluorolube® belongs to OxyChem Corporation; Spectrum™ and Spectrum 10™ belongs to PerkinElmer, Inc; Nujol™ belongs to Schering-Plough;
IRPrestige™ belongs to Shimadzu Corporation; Swagelok® belongs to Swagelok Company; Avatar™, Genesys™, Impact™, iS™5, iS™10, iS™50, Magna-IR™,
Nexus™, Nicolet™, WinFirst™, OMNIC™ and Protégé™ belong to Thermo Fisher Scientific; Excalibur™, Resolutions Pro™ and Scimitar™
belong to Varian, Inc. All other trademarks are the property of PIKE Technologies.
FTIR and UV-V is I nstrument C odes
When ordering a PIKE accessory, replace the XX or XXX portion of the product’s part number with your spectrometer’s instrument
code below. For assistance, please contact a PIKE customer service representative at (608) 274-2721 or [email protected]
F TIR I n s t r u m e n t C o d e s ( X X )
ABB Bomem
FTLA2000-100 (Arid Zone)
80
Michelson 100, MB Series
81
MB 3000
82
Agilent
Excalibur™, Scimitar™, FTS, 600-IR Series
10
Excalibur™, Scimitar™, 600-IR Series with recognition
13
Analect (See Hamilton Sundstrand)
Bio-Rad (See Agilent)
Bruker Optics
IFS™, Vector™, Equinox™ Series.
50
Tensor™, Vertex™ with recognition (Quick-Lock)
51
Buck Scientific
M500
65
60
Horiba
7000 Series
35
Interspectrum
Interspec 200-X
90
Jasco
300/600 Series
56
400
57
4000/6000 Series
58
JEOL
Winspec™ Series
46
Lambda Scientific
Lambda FTIR 7600
66
Lambda FTIR 8600
64
Lumex
INFRALUM FT-02, FT-08
67
Mattson (See Thermo Electron)
Midac
M Series
70
Spectrum™ GX, 2000
71
Spectrum BX / RX, 1600, Paragon 1000
73
Frontier, Spectrum One, 65, 100, 400 with recognition
74
Spectrum Two with recognition
75
Shimadzu
8300, 8400 Series, IRPrestige™-21, IRAffinity-1s
15
IRPrestige™-21, IRAffinity-1s with recognition (QuickStart) 16
IRTracer™-100
18
IRTracer™-100 with recognition
19
Thermo Electron / Nicolet / Mattson
Infinity, Galaxy, RS Series
20
Genesis™, Satellite, IR 300
I nstrument C odes
Impact™ 400, Magna, Protege™, 500 / 700 Series
Digilab (See Agilent)
Hamilton Sundstrand AIT
Diamond 20
PerkinElmer
1700 Series
30
Nicolet (See Thermo Electron)
Oriel
95
Optical Table
99
21
40
Avatar™, Nexus™, Nicolet™, iS™10, iS™50
40
Model 205/210
41
Nicolet iS™5
42
Avatar, Nexus, Nicolet Series with recognition (Smart)
47
Varian (see Agilent)
UV - V i s I n s t r u m e n t C o d e s ( X X X )
Agilent/Varian
Cary 50
100
Cary 60
111
Cary 100, 300
110
Cary 4000, 5000, 6000i
120
Jasco
600 Series
600
Optical Table
999
PerkinElmer
Lambda 650, 750, 850, 950 and 1050
700
Lambda 25, 35, 45
730
Shimadzu
1600 and 1700
200
1800 Series
210
2600
240
3600
220
Thermo Fisher Scientific
Evolution 300/600
400
Evolution 200
410
A lphabetical I ndex
10Spec, Specular Reflectance
52, 150
15Spec, Specular Reflectance
149
20Spec, UV-Vis Specular Reflectance 149
D
H
Demountable Liquid Cell 95
53, 149
Diamond ATR Accessory 45Spec, Specular Reflectance 53, 149
Diamond ATR Probe 72
HATRPlus Diamond Compression Cell
84
Heated, ATR 60Spec, UV-Vis Specular Reflectance 149
80Spec, Specular Reflectance 54
85Spec, UV-Vis Specular Reflectance 151
A
Abrasion Sampling Kit 40, 41, 46
Absolute Reflectance Accessory 56
AGA, Specular Reflectance 55
Alignment Mirror, 10Spec, 80Spec and VeeMAX III 50, 52, 54
Alignment Mirror, 30Spec and 45Spec 53
Alignment Mirror, UV-Vis 149, 151
Anvils for KBr Pellet Dies 103, 104
ATR Crystal Properties 35, 125
Diamond Properties 35, 125
Diffuse Reflectance, Automated 44, 45
Diffuse Reflectance Theory
47
Heated Solid Transmission Accessory DiffusIR Diffuse Reflectance Accessory 40
Digital Force Adapter for High-Pressure Clamp 12, 14, 20
Disks, UV-Vis, NIR and IR Windows 111
EasiDiff Diffuse Reflectance Accessory 40
Education Sampling Kit
5
30, 51
134
F
Falcon Mid-IR Transmission Accessory 98
Falcon NIR Transmission Accessory 100
144
Fiber Optic Accessories BaF2 Disks/Windows 111
Film Maker 125
FlexIR, Mid-IR Hollow Waveguide Accessory 72
FlexIR, NIR Fiber Optic Accessory 75
86
Bolt Press
103
C
CaF2 Properties 125
109
FTIR Instrument Codes
164
G
CaF2 Disks/Windows 111
Card, Disposable Sample Holder 110
Gas Cell Holders 41
Cell Holders
97, 110, 115
Cells, Long-Path Quartz 97
Chunks, KBr 111
Comprehensive Transmission Kit Compression Cells 4
83, 84
Compression Cell, Diamond 84
106, 107
Fluorolube Gas Cell, Heated Catalytic Heat Chambers 116, 117, 118, 120
110, 115
Gas Cells, Long-Path 120
Gas Cell, Low-Volume 117
Gas Cells, Short-Path Stainless Steel
118
Gas Cells, Short-Path Glass
115
Gasera, PA301 and PA101 135
GC-FTIR Interface Accessory 133
Ge Disks/Windows 111
Ge Properties 125
CrushIr Hydraulic Press 106
Cryostat190 Transmission Accessory 101
GladiATR Crystal Polishing Kit 114
GladiATR Options
20
GladiATR Vision 18
Crystal Properties 35, 125
CsI Properties 111
Grazing Angle, Specular Reflectance CsI Disks/Windows 125
Grinders, ShakIR and Super ShakIR
Cuvettes 140
Cuvette Holders 98, 100, 101, 102
110
Holder, Pellets 110
Holder Sample Cards 110
103, 104, 105, 106
2, 105, 106
I
Instrument Codes
164
Integrating Sphere, Mid-IR 64, 66
Integrating Sphere, NIR 64, 67
Infrared Disks/Windows 111
J
JetStream ATR 32
72, 75
BaF2 Properties Beam Condensers Heated Transmission Cell 85
102
Holders, Sample Hydraulic Press E
Falcon UV-Vis Transmission Accessory B
107
Hydraulic Die 26, 29
128, 129
85, 98, 100, 101
Heated S100-R Microscope Stage External Sample Module Automated Wafer Analysis 41
Heated, Liquid Sample Holder Heated Platens Accessory 7, 10, 15, 18
44
Heated, Diffuse Reflectance 39
ATR, Single Reflection AutoDiff, Automated Diffuse Reflectance 21
10, 15, 18, 21, 26, 29, 32
41
Electrochemistry 35
21
Diffuse Reflectance, Heating 6, 10, 21, 26
ATR Theory 3, 4, 103
HATR Diffuse Reflectance Products ATR, Multiple Reflection ATR, Variable Angle 10, 15, 18, 72
Hand Press
30Spec Specular Reflectance 15, 18
50, 54, 55
K
KBr, Chunks and Powder 109, 111
KBr Disks/Windows 111
KBr Pellet Making 103, 104, 105, 106
KBr Properties 125
L
Luer Syringes 95, 96
Library Spectra Liquid Transmission Cells
160, 161
2, 3, 4, 5, 94, 95, 96 97
Liquid Cell, Demountable 95
Liquid Cell, Sealed 96
Liquid Recirculator 42, 85, 98, 100, 143, 144
Liquids Retainer and Volatiles Cover 13, 14, 17, 19, 20
Liquid Sampling, ATR 6, 7, 10, 15, 18, 21, 26, 29, 32
Liquid Sampling, Transmission Long-Path Gas Cells Long-Path Quartz Liquid Cells
94, 95, 96, 97
120
97
108
100, 141, 144, 142
165
M
Polyethylene Properties 125
Polystyrene Reference Material 156
Magnetic Film Holder 110
MappIR Automated Wafer Analyzer 129
Premium Sampling Kit
MAP300 Automated Wafer Analyzer
129
Press, Hydraulic Materials, IR Properties 125
Micro Compression Cell
83, 84
Micro Diamond Compression Cell 84
µMAX IR Microscope
80
Micro Plane
83
Microplate Reader 45, 93, 153
Microscope, Heated Stage
85
Microscope, µMAX
80
Microtiter Plates 45, 93
MIRacle ATR Accessory 10
Mirror, Alignment 30Spec and 45Spec
53
Mirror, Alignment 10Spec, 80Spec and VeeMAX III 50, 52, 54
Powder, KBr 109, 111
2
2, 105, 106
Press-On Mull Cell 94
Q
94
Mull Agents Multi-Reflection ATR Multi-SamplIR, Transmission RotatIR
91
S100-R Heated Microscope Stage 85
ShakIR Sample Grinder 44
100, 102
40, 41, 43, 44, 45
NIR Falcon Accessory 100
NIR, XY Autosampler 45, 93
NIST Traceable NIR Standard 157
NIST Traceable Polystyrene Film 156
Nujol 109
97
Optical Materials 111
Ordering Information
163
P
Pellet Press Short-Path Gas Cells
108
115, 116, 117, 118, 131
Si Disks/Windows 111
Si Properties 125
Single Reflection ATR, GladiATR 15, 18
Single Reflection ATR, MIRacle 7, 10
Single Reflection ATR, VeeMAX III 29
SiO2 Disks/Windows 111
SiO2 Properties 125
Solid Sampling, Transmission 102, 103, 104, 105, 106, 107
Spacers Spectral Databases Specular Reflectance Accessories
94, 95
160, 161
34
103, 104, 105, 106
Temperature Control, Diffuse 41
Temperature Control, ATR 10, 14, 15, 18, 20, 21, 26, 29, 32
Terms and Conditions
163
TGA/FTIR Accessory 131
Theory, ATR 35
Theory, Diffuse Reflectance
47
Pestle and Mortar 109
Theory, Integrating Sphere 69
Photoacoustic Accessories 135
Theory, Polarization 61
PIKECalc Software 159
Theory, Specular Reflectance Plate Reader
Polarizers
Polyethylene Disk/Windows
45, 93, 153
60, 147
111
Vacuum Pump Value-Line Sampling Kit Variable Angle ATR, ATRMax II Variable Angle ATR, VeeMAX III
Variable-Path Gas Cell VATR VeeMAX III, ATR VeeMAX III, Motorized VeeMAX III, Specular Reflectance 42, 101, 106
6
26
29
120
34
29
29, 50
50
VeeMAX, UV-Vis Specular Reflectance 152
Vertical Wafer Transmission Accessory 128
W
Wafer Analyzers
128, 129
Windows Properties 125
Windows/Disks 111
Wire-Grid Polarizers 60
X
XY Autosampler, Diffuse Reflectance 45
XY Autosampler, Transmission 93
ZnS Disks/Windows 111
ZnS Properties 125
ZnSe Disks/Windows 111
ZnSe Properties 125
Temperature Control, Transmission 98, 100, 101, 102
142
2, 105
152
Z
Peltier Cuvette Holders Pixie Hydraulic Press
UV-Vis VeeMAX 49
T
O
Parallelogram ATR Crystal
96
10, 21, 26
125
Oil in Water Analysis
Sealed Liquid Cell 128, 129, 137
NaCl Properties NIR, Diffuse Reflectance 134
128, 129, 137
111
NIR, Heated Transmission 2, 3, 4, 5, 6, 7
Sample Module, External Semiconductor Wafers NaCl Disks/Windows NIR, AutoDiff Sampling Kits Semiconductor Applications N
164
147, 148
V
S
109
90, 92
141, 142
149, 150, 151,
R
110
Mull Cell 140
UV-Vis Holders UV-Vis Specular Reflectance Accessories
108
29, 50
139
UV-Vis Cuvettes UV-Vis Polarizers
Sample Holders, Transmission Motorized VeeMAX III UV-Vis Accessories UV-Vis Instrument Codes Sample Grinder 109
49
151
140
Monolayer Analysis 60, 147
UpIR Diffuse Reflectance Accessory 141
110
Mortar and Pestle 110
UV-Vis 85Spec Quartz Cuvettes Sampling Cards, Disposable Motorized Polarizer 7
Universal Sample Holder Quartz Liquid Cells, Long-Path Mirror, Alignment UV-Vis Spec Accessories 149, 150, 151, 152
29, 50, 54, 62
U
Ultima Sampling Kit Theory, Transmission Transmission, Auto Samplers Transmission Liquid Cell Transmission Liquid Cell, Heated Transmission Sampling Kits
57
123
90, 91, 92, 93
95, 96
98
2, 3, 4, 5
166
PIKE Technologies, Inc.
6125 Cottonwood Drive
Madison WI 53719
(608) 274-2721 (Tel)
(608) 274-0103 (Fax)
[email protected]
www.piketech.com
Anadis Instruments Benelux B.V.
Guadeloupestraat 30, 1339 ME Almere
www.anadis.nl, [email protected]
T: +31 36 5214190
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