Reflectometer Series

Reflectometer Series:

R54, R60 & R140

Vector Network Analyzers

KEY FEATURES

Patent: US 9,291,657 No test cable needed

Frequency range: 1 MHz - 6.0 GHz or 85 MHz – 5.4 or 14 GHz

Measurement time per point: 100 or 200 μs min typ.

Number of measurement points: 2-100,001

Time domain with gating included standard

Distributed By:

Signal Test, Inc

1529 Santiago Ridge Way

San Diego, CA 92154

Tel. 1-619-575-1577 USA www.SignalTestInc.com

[email protected]

2

Real Performance, Real Value.

Advanced

CMT analyzers take advantage of breakthrough advances in RF technology as well as the faster processing power, larger display, and more reliable performance of an external PC, while also simplifying maintenance of the analyzer.

Accurate

Our VNAs are made with high standards. Every instrument is lab-grade quality, with a wide dynamic range, low noise floor, high resolution sweep, and a variety of other advanced features. The metrology of R54, R60 and R140 deliver real measurement accuracy and reliability.

Cost Effective

CMT VNAs are flexible, easy to maintain, and are well-suited for lab, production, field, and secure testing environments. With every bit of performance of traditional analyzers, but at a fraction of the cost, now every engineer and technician can have a highly accurate VNA.

These reflectometers ultra compact dimensions make them unique. At just 8.8 to 12.3 oz, they are easily transported between workstations or used in applications requiring mobility. R54, R60 and R140 present an excellent value solution for engineers and technicians: while they perform with the accuracy of a benchtop unit, they are equally well suited to field use or mass production environments.

R54, R60 and R140 are USB vector reflectometers that operate in the frequency range from 1 MHz to 6.0 GHz or 85 MHz to 5.4 or 14 GHz. They are designed for use in the process of development, production, and field testing of various electronic devices in multiple environments, includeing operation as a component of an automated system.

The reflectometers connect directly to the DUT without the use of a test cable, so there is higher calibration stability in the test setup and the cost of the accessory replacement is significantly decreased. The device works with software on an external PC and is powered and operated by a USB interface.

3

Applications

4

Antenna testing

Reflectometers easily fit into many field test applications. They can be used with a ruggedized laptop to perform critical measurements in the field, such as antenna feeder systems. Because no test cable is needed, calibration stability is higher in the test setup and the cost of accessory replacement is significantly decreased.

Applications

Materials Test

Reflectometers allow the user perform measurement of material properties, such as dielectric constant and dielectric loss tangent. Its compact size and lack of test cables allowed SPEAG to use a reflectometer with a probe to perform materials testing.

5

6

Measurement Capabilities

Measured parameters

S

S

11

, cable loss

11

, |S

21

|, |S

12

|, S

22

- using two Reflectometers.

Number of measurement channels

Up to 4 independent logical channels. Each logical channel is represented on the screen as an individual channel window. A logical channel is defined by such stimulus signal settings as frequency range, number of test points, etc.

Data traces

Up to 4 data traces can be displayed in each channel window. A data trace represents one parameter of the

DUT such as magnitude and phase of S

11

, DTF, cable loss.

Memory traces

Each of the 4 data traces can be saved into memory for further comparison with the current values.

Data display formats

SWR, Return loss, Cable loss, Phase, Expand phase, Smith chart diagram, DTF SWR, DTF return loss, Group delay, Lin

Magnitude.

Measurement Range

R54 and R60 can measure return loss up to 35 dB in their entire frequency range. R140 can measure return loss up to

35 dB from 85 MHz to 4.8 GHz and 25 dB from 4.8 GHz to

14 GHz. R140, which is a specification typical of benchtop instrumentation.

Pictured: R54 testing in the entire frequency range of 85 MHz to 5.4 GHz, the return loss is shown at 35 dB

Dynamic Range

Typical dynamic range of the |S

21

| and |S

12

| measurements using two reflectometers across the entire frequency range at

100 Hz IF bandwidth for R54 is 97 dB, typ. and for R60 is 109 dB. typ. The dynamic range for R140 at 100 Hz IF bandwidth from 85 MHz to 4.8 GHz is 107 dB typ. and from 4.8 GHz to 14

GHz is 74 dB typ.

Pictured: R54 at 87 dB across the entire frequency range (at 1 kHz IF bandwidth)

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8

Sweep Features

Trace Functions

Sweep type

Linear frequency sweep, logarithmic frequency sweep, and segment frequency sweep.

Measured points per sweep

Set by the user from 2 to 100,001.

Segment sweep features

A frequency sweep within several independent user-defined segments. Frequency range, number of sweep points and IF bandwidth should be set for each segment.

Output Power

Min: -35 dBm depending on model

Max: +5 dBm depending on model

Sweep trigger

Trigger modes: continuous, single, or hold.

Trigger sources: internal, bus.

Trace display

Data trace, memory trace, or simultaneous indication of data and memory traces.

Trace math

Data trace modification by math operations: addition, subtraction, multiplication or division of measured complex values and memory data.

S-parameters display

The program allows to load into data memory Touchstone file(*.s1p and *.s2p).

Autoscaling

Automatic selection of scale division and reference level value to have the trace most effectively displayed.

Electrical delay

Calibration plane moving to compensate for the delay in the test setup. Compensation for electrical delay in a DUT during measurements of deviation from linear phase.

Phase offset

Phase offset is defined in degrees.

Frequency Scan Segmentation

Reflectometers have a large frequency range with the option of frequency scan segmentation. This allows the user an opportunity to use the reflectometer, for example, to realize the maximum dynamic range while maintaining high measurement speed.

Pictured: Two R54s are shown with a demo filter. Users can measure |S

21

| and |S

12

| of the DUT using two reflectometers connected to the same USB hub.

Port Extension

Port Extension is a feature that allows for moving the calibration reference plane of the port by specifying the electrical delay to the new reference plane position.

Additionally, it is possible to account for loss in the extended port.

Automatic Port Extension is a feature that allows for automatic calculation of the electrical delay of the extended port and its loss by attaching an Open and/or a Short calibration standard at the new calibration reference plane position.

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Time Domain Measurements

Distance to Fault (DTF)

DTF mode is enabled by selecting either the DTF SWR or

DTF return loss format. The instrument will automatically transform measured data from the frequency domain to time domain, and then to distance based on the velocity of propagation. DTF easily finds fault points in cables or connectors.

Distance resolution can be maximized by selecting a wide measurement frequency range. Likewise, the maximum measured distance is proportional to the number of stimulus points.

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Here, built-in DTF measurement allows the user to detect a physical impairment in the antenna feeder.

Gating

This function mathematically removes unwanted responses in the time domain, which allows the user to obtain frequency response without influence from the fixture elements. The function applies reverse transformation back to frequency domain after cutting out the user-defined span in time domain.

Gating filter types: bandpass or notch. For a better tradeoff between gate resolution and level of spurious sidelobes the following filter shapes are available: maximum, wide, normal and minimum.

Embedding

This function allows the user to mathematically simulate the

DUT parameters after virtual integration of a fixture circuit between the calibration plane and the DUT. This circuit can be described by an S-parameter matrix in a Touchstone file.

De-Embedding

The function allows to mathematically exclude from the measurement result the effect of the fixture circuit connected between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a

Touchstone file.

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Port Impedance Conversion

This is the function converts the S-parameters measured at

50 port into values, which could be determined if measured at a test port with arbitrary impedance.

S-Parameter Conversion

The function allows conversion of the measured

S-parameters to the following parameters: reflection impedance and admittance, inverse S-parameters and conjugation.

Data Output

Analyzer State

All state, calibration and measurement data can be saved to an Analyzer state file on the hard disk and later uploaded back into the software program. The following four types of saving are available: State, State & Cal.

Trace Data CSV File

The VNA allows the user to save an individual trace data as a

CSV file (comma separated values). The active trace stimulus and response values in the current format are saved to *.CSV file. Only one trace data are saved to the file.

Trace Data Touchstone File

R54, R60 and R140 allow the user to save S-parameters to a Touchstone file. The Touchstone file contains the frequency values and S-parameters. The files of this format are typical for most of circuit simulator programs. S

11 parameters are saves using *.s1p files.

Only one (active) trace data are saved to the file.

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Limit Testing

Setting Pass-Fail Tests

The limit test is a function of automatic pass/fail judgment for the trace of the measurement result. The judgment is based on the comparison of the trace to the limit line set by the user.

The limit line can consist of one or several segments. Each segment checks the measurement value for failing whether upper or lower limit. The limit line segment is defined by specifying the coordinates of the beginning (X0, Y0) and the end (X1, Y1) of the segment, and type of the limit. The MAX or

MIN limit types check if the trace falls outside of the upper or lower limit, respectively.

Measurement Automation

COM/DCOM compatible

Reflectometer software is COM/DCOM compatible allowing the unit to be used as a part of measuring stands and different special applications. COM/DCOM automation is used for remote control and data exchange with the user software.

The reflectometer program runs as a COM/DCOM server, while the user program runs as COM/DCOM client. The COM client runs on the VNA PC, and the DCOM client runs on a separate

PC connected via LAN.

LabView compatible

The device and its software are fully compatible with

LabView applications, for ultimate flexibility in user-generated programming and automation.

Accuracy Enhancement

Calibration

Calibration of a test setup (which includes the VNA, cables, and adapters) significantly increases the accuracy of measurements. Calibration allows for correction of the errors caused by imperfections in the measurement system: system directivity, source match and tracking.

Calibration methods

The following calibration methods of various sophistication and accuracy enhancement level are available:

• reflection normalization

• transmission normalization (when using two reflectometers)

• full one-port calibration

Reflection and transmission normalization

This is the simplest calibration method; however, it provides reasonably low accuracy compared to other methods.

Full one-port calibration

Method of calibration performed for one-port reflection measurements. It ensures high accuracy.

Mechanical Calibration Kits

The user can select one of the predefined calibration kits of various manufacturers or define a new calibration kit.

Electronic Calibration Modules

Electronic, or automatic, calibration modules offered by

CMT make calibration faster and easier than traditional mechanical calibration.

Defining of calibration standards

Different methods of calibration standard defining are available: standard definition by polynomial model standard definition by data (S-parameters)

Error correction interpolation

When the user changes any settings such as the start/stop frequencies or the number of sweep points, compared to the settings at the moment of calibration, interpolation or extrapolation of the calibration coefficients will be applied.

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TECHNICAL SPECIFICATIONS

1

Impedance

Test port connector

Number of test ports

Frequency Range

Full CW Frequency

Frequency Setting Resolution

Number of Measurement Points

(with 1/1.5/2/3/5/7 steps)

Cable loss measurement range

Dynamic range of |S

21

| and |S

12

|

3

Measurement Range

R54 R60

R140

50 Ω 50 Ω

50 Ω

N-type male N-type male

N-type male

1

1

1

85 MHz to 5.4 GHz

2

±5x10

–6

85 MHz to 5.4 GHz

1 MHz to 6 GHz

±2.5x10

–6

1 MHz to 6.0 GHz

85 MHz to 14 GHz

±2.5x10

–6

85 MHz to 4.8 GHz 4.8 GHz to 14 GHz

10 Hz

2 to 100,001

20 Hz

2 to 100,001

10 Hz

2 to 100,001

25 Hz

10 Hz to 100 kHz (with 1/3 step)

10 Hz to 30 kHz (with 1/3 step)

85 MHz to 5.4 GHz

35 dB

85 MHz to 5.4 GHz

IF bandwidth 100 Hz

97 dB typ.

1 MHz to 6.0 GHz

35 dB

1 MHz to 6.0 GHz

IF bandwidth 100 Hz

109 dB, typ.

85 MHz to 4.8 GHz 4.8 GHz to 14 GHz

35 dB 30 dB

85 MHz to 4.8 GHz 4.8 GHz to 14 GHz

IF bandwidth 100 Hz

107 dB, typ.

74 dB, typ.

Accuracy of reflection measurements

4

(magnitude/phase)

-15 dB to 0 dB

-25 dB to -15 dB

-35 dB to -25 dB

Accuracy of transmission magnitude measurements

-40 dB to 0 dB

-50 dB to 0 dB

-25 dB to 0 dB

Trace Stability

Trace noise magnitude

(high output power, IF bandwidth

1 kHz)

Temperature dependence

(per one degree of temperature variation)

Measurement Accuracy

R54

85 MHz to 5.4 GHz

R60

1 MHz to 6.0 GHz

0.4 dB / 4°

1.5 dB / 7°

4.0 dB / 22°

0.4 dB / 3°

1.0 dB / 6°

3.0 dB / 20°

1.0 dB

-

-

0.015 dB rms

0.02 dB

-

1.0 dB

-

0.005 dB rms

0.015 dB

R140

85 MHz to 4.8 GHz 4.8 GHz to 14 GHz

0.4 dB / 4°

1.2 dB /8°

4.0 dB / 22°

1.0 dB / 7°

1.5 dB / 10°

5.0 dB / 29°

-

1.0 dB

-

0.005 dB rms

0.015 dB

-

-

1.0 dB

0.050 dB rms

0.030 dB

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1

All technical specifications subject to change without notice.

2

All specification in the frequence range from 4.8 GHz to 5.4 GHz are typical.

3

Measurement of |S

21

| and |S

12

| using two reflectometers, both being connected to the same USB hub, applies over the temperature range of 23°C ± 5°C after 30 minutes of warming-up, with less than 1°C deviation from the calibration temperature at high output power and

IF bandwidth 100 Hz.

4

Applies over the temperature range of 23°C ± 5°C after 30 minutes of warming-up, with less than 1°C deviation from the full one-port calibration temperature at high output power and IF bandwidth 100 Hz.

TECHNICAL SPECIFICATIONS

Effective directivity

Effective source match

Effective reflection tracking

Effective directivity

Directivity

(without system error correction)

Match

(without system error correction)

Output power

High level

Low level

Power range

Power resolution

Interference immunity

Damage level

Damage DC voltage

Measurement time per point, min typ.

R54

85 MHz to 5.4 GHz

45 dB

37 dB

0.10 dB

Effective System Data

4

R60

1 MHz to 6.0 GHz

46 dB

40 dB

0.05 dB

Effective Factory Calibrated Data

85 MHz to 4.0 GHz 4.0 GHz to 5.4 GHz

36 dB 32 dB

1 MHz to 4.0 GHz

36 dB

Test Port

4.0 GHz to 6.0 GHz

32 dB

18 dB 15 dB, 18 dB typ.

18 dB 15 dB, 18 dB typ.

85 MHz to 5.4 GHz

-10 dBm, typ.

-30 dBm, typ.

-

-

+17 dBm

+23 dBm

50 V

1 MHz to 6.0 GHz

-

-

-35 to 0 dBm (-37 to +5 dBm typ.)

0.25 dB, typ.

+17 dBm

+23 dBm

50 V

Measurement Speed

200 µs 100 µs

R140

85 MHz to 4.8 GHz 4.8 GHz to 14 GHz

45 dB

37 dB

0.10 dB

42 dB

35 dB

0.20 dB

-

-

10 dB, 15 dB typ.

10 dB, 15 dB typ.

85 MHz to 4.8 GHz 4.8 GHz to 14 GHz

0 dBm, typ.

-10 dBm, typ.

-35 dBm, typ.

-

-

+17 dBm

+23 dBm

50 V

200 µs

4

Applies over the temperature range of 23°C ± 5°C after 30 minutes of warming-up, with less than 1°C deviation from the full one-port calibration temperature at high output power and IF bandwidth 100 Hz.

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External reference frequency

Input level

Input impedance at Ref input

Connector type

Output reference signal level

at 50 Ω impedance Ref output

Ref connector type

External trigger

Pulse width

Input impedance at «Ext Trig»

Input connector type

Operating temperature range

Storage temperature range

Humidity

Atmospheric pressure

Calibration interval

Operating system

CPU frequency

RAM

Connector type

Interface

Power consumption

Dimensions (L x W x H)

Weight

General Data

R54

-

-

-

-

-

R60

10 MHz

2 dBm ± 2 dB

50 Ω

SMA, female

3 dBm ± 2 dB

-

-

-

-

SMA, female

3.3 V CMOS, TLL compatible

More than 1 µs

At least 10 kΩ

SMA, female

Atmostpheric Tolerances

-10°C to +50°C

-40°C to +55 °C

90% at 25°C

84 to 106.7 kPa

Calibration Frequency

-10°C to +50°C

-40°C to +55°C

90% at 25°C

84 to 106.7 kPa

3 years 3 years

External PC System Requirements

Windows: XP, Vista, 7, 8, 10

1 GHz

2 GB

Windows: XP, Vista, 7, 8, 10

1 GHz

2 GB

Connection to PC

Mini USB B

USB 2.0

2 W

4.7 x 1.7 x 0.9 in

8.8 oz

Mini USB

USB 2.0

3.5 W

6.4 x 2.6 x 1.2in

12.3 oz

R140

32 MHz

2 dBm ± 2 dB

50 Ω

SMA, female

3 dBm ± 2 dB

SMA, female

3.3 V CMOS, TLL compatible

More than 1 µs

At least 10 kΩ

SMA, female

-10°C to +50°C

-40°C to +55°C

90% at 25°C

84 to 106.7 kPa

3 years

Windows: XP, Vista, 7, 8, 10

1 GHz

2 GB

Mini USB B

USB 2.0

3 W

4.5 x 2.0 x 0.9 in

10.6 oz

18

Front and Back Panels

32

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