Protek A338 4port 영문 브로슈어 20130415 ver 2001

Protek A338 4port 영문 브로슈어 20130415 ver 2001
TEST &
MEASURING
INSTRUMENTS
Analyzer
(4 Ports)
4 Ports
Key Features
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Frequrncy Range : 100kHz ~ 8GHz, 16 Parameters support (S11 ~ S44)
Measurement time per point : 100us per point
Wide Output Power Range : -60dBm to +10dBm
Dynamic Range : >150dB (1Hz IF bandwidth)
Time domain and gating conversion included
Two Independent Signal Sources
Frequency offset mode, including vector mixer calibration measurements
Up to 16 logical channels with 16 traces each
Multiple precision calibration methods and automatic calibration
Up to 500,001 measurement points
Fixture simulation
COM/DCOM compatible for LabView and automation programming
Measurement Capabilities
Measured Parameters
S11, S22, S33, S44, S12, S13, S14, S21, S23, S24, S31, S32, S34, S41, S42, S43 and
absolute power of the reference and received signals at the port.
Number of Measurement Channels
Up to 16 independent logical channels : each logical channel is represented on the screen
as an individual channel window. A logical channel is defined by such stimulus signal settings
as frequency range, number of test points, or power level.
Data Traces
Up to 16 data traces can be displayed in each channel window. A data trace represents
one of such parameters of the DUT as S-parameters, response in time domain,
input power response.
Memory Traces
Each of the 16 data traces can be saved into memory for further comparison with
the current values.
Data Display Formats
Logarithmic magnitude, linear magnitude, phase, expanded phase, group delay, SWR,
real part, imaginary part, Smith chart diagram and plar diagram display formats are available.
Dynamic Rnage
Typical dynamic range of 150dB is achieved through the entire frequency range
(at 1Hz IF bandwidth)
Low Measurement Errors
this devices have a low vatiation between a large pool of manufactured instruments.
Low trace noise allows for particularly high-precision measurements.
Key Features
Mixer/Converter Measurements
Scalar Mixer /
Converter Measurements
The scalar method allows the user to measure only the magnitude of the transmission
coefficient of the mixer and other frequency translating devices. No external mixers
or other devices are required. The scalar method employs port frequency offset when
there is a difference between the source port frequency and the receiver port frequency.
Scalar Mixer / Converter Calibration
This is the most accurate method of calibration applied for measurements of mixers in
frequency offset mode.
Vector Mixer /
Converter Measurements
The vector method allows the measurement of both the magnitude and phase of the
mixer transmission coefficient.
Vector Mixer / Converter Calibration
This method of calibration is applied for vector mixer measurements.
Automatic Frequency
Offset Adjustment
The function performs automatic frequency offset adjustment when the scalar mixer /
converter measurements are performed to compensate for internal LO setting inaccuracy
in the DUT.
Sweep Trigger
Trigger Modes : continuous, single, or hold.
Trigger Sources : internal, manual, external, bus
Sweep Features
Sweep Type
Linear frequency sweep, logarithmic frequecny sweep, and segment frequency sweep
occur when the stimulus power is a fixed value. Linear power sweep occurs when
frequency is a fixed value.
Measured Points Per Sweep
Set by the user from 2 to 500,001.
Segment Sweep Features
A frequency sweep within several independent user-defined segments. Frequency range,
number of sweep points, source power, and IF Bandwidth should be set for each segment.
Power
Source power from -60dBm to +10dBm with resolution of 0.05dB. In frequency sweep
mode, the power slope can be set to up to 2dB/GHz for compensation of high frequency
attenuation in connection wires.
Sweep Trigger
Trigger Modes : continuous, single, or hold.
Trigger Sources : internal, manual, external, bus
Trace Functions
Trace Display
This function performs data transformation from frequency domain into response of
the DUT to various stimulus types in time domain. Modeled stimulus types:
bandpass, lowpass impulse, and lowpass step. Time domain span is set by the user
arbitrarily from zero to maximum, which is determined by the frequency step.
Time Domain Gating
This function mathematically removes unwanted responses in the time domain,
which allows the user to obtain frequency response without influence from fixture
elements.
Limit Testing
Limit testing is a function of automatic pass/fail judgment for the trace of
the measurement results. The judgment is based on the comparison of the trace to
the limit line set by the user and can consist of one or several segments.
Data trace, memory trace, or simultaneous indication of data and memory traces.
Trace Math
Data trace modification by math operations:
addition, subtraction, multiplication or division of measured complex values and
memory data.
Autoscaling
Automatic selection of scale division and reference level value allow the most effective
display of the trace.
Electrical Delay
Calibration plane moving to compensate for the delay in the test setup. Compensation
for electrical delay in a device under test (DUT) during measurements of deviation from
linear phase.
Phase Offset
Phase offset is defined in degrees.
Frequency Scan Segmentation
This VNA has a large frequency range with the option of frequency scan segmentation.
This allows optimal use of the device, for example, to realize the maximum dynamic
range while maintaining high measurement speed.
Power Scanning and
Compression Point Recognition
The power sweep feature turns compression point recognition, one of the most
fundamental and complex amplifier measurements, into a simple and accurate operation.
Balanced Measurements
Time Domain Measurements
This function enables evaluation of devices with balanced ports, for instance, differential
amplifiers or transformers, as pictured here.
Port Impedance Conversion
S-Parameter Conversion
The function of conversion of the S-parameters measured at 50 port into the values,
which could be determined if measured at a test port with arbitrary impedance.
The function allows conversion of the measured S-parameters to the following
parameters: reflection impedance and admittance, transmission impedance and
admittance, and inverse S-parameters.
TFT Color LCD
(10.4-inch)
Daylight viewable
high resolution LCD
display
Power & LED
USB
Power On/Off
Greed LED: Power On Status
Red LED : External Power
Instrument states,
Calibration data and
Trace data can be
stored on an external
USB drive.
Screen Menu
Soft Key
Enter
Knob / Arrow
Display selectable
menu in connection
with function keys or
soft keys
Selec menu displayed
on the screen
Input numeric values
Move marker positions
or items on the table list
Technical Specifications
Measurement Range
Impedance
Test Port Connector
Number of Test Ports
Frequency Range
Full CW Frequency Accuracy
Frequency Setting Resolution
Number of Measurement Points
Measurement Bandwidths
Dynamic Range (IF Bandwidth 10 Hz)
From 100 KHz to 300 KHz:
From 300 KHz to 8.0GHz:
Test Port Output
50Ω
N-type, Female
4
100 KHz to 8.0 GHz
±5x10¯6
1Hz
1 to 500,001
1 Hz to 30 KHz (with 1/1.5/2/3/5/7 steps)
115 dB, typ. 125 dB
Measurement Speed
Match (without system error correction)
Power Range
100 KHz to 6.0 GHz
6.0 GHz to 8.0 GHz
Power Accuracy
Power Resolution
Harmonics Distortion
From 300 KHz to 8.0 GHz:
Non-harmonic Spurious
From 300 KHz to 8.0 GHz:
18 dB
100 ㎲
10 ms
-60 dBm to +10 dBm
-60 dBm to +5 dBm
±1.5 dB
0.05 dB
-25 dBc
-30 dBc
135 dB, typ. 140 dB
Typical Cycle Time Versus Number of Measurement Points
Measurement Accuracyv
51
201
401
1601
Uncorrected
13.1 ms
51.3 ms
102.3 ms
408.3 ms
Full Two-port Calibration
45.5 ms
122.0 ms
230.5 ms
840.5 ms
Uncorrected
6.5 ms
21.1 ms
40.5 ms
157.7 ms
Full Two-port Calibration
32.4 ms
61.7 ms
100.3 ms
333.0 ms
Accuracy of Transmission Measurements (Magnitude / Phase)
+5 dB to +15 dB
-50 dB to +5 dB
-70 dB to -50 dB
From 100 KHz to 300 KHz:
From 300 KHz to 8.0 GHz:
-90 dB to -70 dB
From 300 KHz to 8.0 GHz:
Measurement time per point
Source to receiver port switchover time
0.2 dB / 2º
Start 100 KHz, stop 10 MHz, IF bandwidth 30 KHz
0.1 dB / 1º
Start 10 MHz, stop 8.0 GHz, IF bandwidth 30 KHz
1.5 dB / 10º
0.2 dB / 2º
1.0 dB / 6º
Trace Stability
Trace Noise Magnitude
(IF Bandwidth 3 KHz)
From 100 KHz to 300 KHz:
From 300 KHz to 8.0 GHz:
Temperature dependence
(Per One Degree of Temperature Variation)
General Data
5 mdB rms
1 mdB rms
0.02 dB
Test Port
Directivity
(without system error correction)
External Reference Frequency
Input Level
Input Impedance at <<10 MHz>> Input
Connector Type
10 MHz
100 KHz to 300 KHz: 15 dB
300 KHz to 8.0 GHz: 18 dB
Output Reference Signal Level at
50Ω Impedance
<<OUT 10 MHz>> Connector Type
50Ω
BNC Female
3 dBm ± 2 dB
+26 dBm
35 V
From 100 KHz to 300 KHz: -105 dBm
From 300 KHz to 8.0 GHz: -125 dBm
Operating Temperature Range
Storage Temperature Range
Humidity
Atmospheric Pressure
3 years
External PC System Requirements
Operating System
CPU Frequency
RAM
Windows XP, Vista, 7, 8
1 GHz
512 MB
Power Supply
BNC Female
Atmospheric Tolerances
18 dB
Calibration Interval
2 dBm ± 3 dB
Output Reference Signal
Test Port Input
Match (without system error correction)
Damage Level
Damage DC Voltage
Noise Level (defined as the rms value
of the specified noise floor,
IF bandwidth 10 Hz)
Calibration Frequency
External Reference Frequency
+41 ℉ to +104 ℉ (+5 ℃ to +40 ℃)
-49 ℉ to +131 ℉ (-45 ℃ to +55 ℃)
90% at 77 ℉ (25 ℃)
84 to 106.7 kPa
Power Supply
Power Consumption
Dimensions (L x W x H)
Weight
110-240 V, 50/60 Hz
60 W
12.8 x 16.3 x 3.8 in (324 x 415 x 96 mm)
19.8 lbs (9 kg)
GS Instruments Co.,Ltd.
1385-14, Juan-dong, Nam-ku, Incheon
402-200, Korea
Tel +82-32-870-5655
Fax +82-32-870-5640
E-mail [email protected]
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