Flash Memory Test Systems

Flash Memory Test Systems
APT SYSTEMS
Flash Memory Test Systems
Semiconductor
Characterization
Keithley’s Flash Memory Test Systems offer producers of flash memory devices
an accurate, turnkey approach to device characterization and/or production
monitoring. These testers are based on high-speed pulse generators, a solid
state switching system, and powerful software tools that simplify device development and control. They are designed as an expansion of Keithley’s proven
S400 and S600 Series Parametric Test Systems, so semiconductor production
facilities can broaden their device testing capabilities quickly and cost-effectively. Now, there’s a single system solution for a wide range of parametric, flash
memory, and other non-volatile memory device testing tasks.
Keithley offers two different versions
O R D E R I N G I N F O R M AT I O N
of the Flash Memory Test System. One
Flash Memory Test Systems
system is tailored for the characteriThis product is available with an Extended
zation needs of development groups,
Warranty. See page 635 for complete
ordering information.
and the other is designed to address
production monitoring needs. The
Flash Memory Development System is designed for R&D and device characterization work. The hardware configuration for this option shortens the process of making cell lifetime measurements. This system includes a Keithley
9332-PCU (Pulse Control Unit) and two HP81110 dual-channel pulse generators. For production test applications that don’t require the system to characterize cells, the Flash Memory Production System offers an economical
alternative for monitoring device quality during manufacturing. This system
includes pulse generators and control software.
System Description
• High-speed integrated hardware and software package
• Flexible endurance testing module
• Data link to engineering analysis tools
• Simple ASCII file test setup
The Flash Memory Test Systems build upon the high speed and accuracy inherent in the S400 and S600 Series Parametric Test Systems. Signals may be switched
through the normal system matrix or through a set of solid-state relays. Extremely
crisp pulses can be delivered to any pin using either technique. The Flash
Memory System can deliver pulses as short as 50ns through the switching matrix.
Many device lifetime tests require the
test system to perform thousands of
program/erase cycles. The constant
switching involved in performing
these cycles can shorten the life of
mechanical relays in a switching
matrix. However, through the use of
solid-state switches in the 9332-PCU,
Keithley’s flash measurement hardware can improve test times and
extend the lifetime of the switching
matrix.
SPECIFICATIONS
MINIMUM PULSE WIDTH: 50ns.
MINIMUM RISE/FALL TIME: 20ns.
MAXIMUM PULSE AMPLITUDE: 20V (into an
open).
PULSE AMPLITUDE ACCURACY: 1% + 100mV.
TEST TIME (100,000 cycles): <2 hours typical.
MEASUREMENT
CONFIGURATION
• 1 DUT terminal pulse for program and erase
or pulse for program or erase and float/bias/
ground for opposite state
• 2 DUT terminals pulse for program or erase
and float/bias/ground for opposite state
• 2 DUT terminals bias or ground for program
and erase
TESTS SUPPLIED
1. Program/Erase Cycle
2. Vt Convergence
QUESTIONS?
1-800-552-1115
(U.S. only)
Call toll free for technical assistance,
product support or ordering information, or
visit our website at www.keithley.com.
3. Single Event (Program or Erase)
4. Gate Coupling Ratio
5. Transistor I-V Curve
6. Stress vs. Time
w w w. k e i t h l e y. c o m
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