Wintec Slim SATA Solid State Drive

Wintec Slim SATA Solid State Drive
SF-2281
WxESxxxG1TA-D41xxx
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Please contact your nearest Wintec representative for the latest updates or additional product information.
Datasheet
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Page 1
Product Introduction
Wintec Embedded Slim SATA-III/II Solid State Drive SF-2281 Series
WxESxxxG1TA-D41x
The Wintec Industries SF-2281 Embedded Slim SATA SSD series of
ROHS Compliant Solid State Drives are constructed with NAND-type
flash memory devices paired with SandForce SF-2281 SSD controller for
virtual-to-physical address mapping and other sophisticated flash
management functions. The Wintec Flash Solid State Disk (SSD)
provides major advantages over the traditional magnetic hard disk
drive (HDD). Faster access time and transfer rate, silent operation and
low power consumption, better shock and vibration resistance, and
lower total cost of ownership make the Wintec SSDs an attractive
choice as the next generation mass storage device.
The SF-2281 series SSD provides high-speed data transfer and
reliability utilizing SLC or MLC NAND-flash in storage capacities ranging
*
from 32GB to 240GB, in a MO-297 form factor. Its robust design
enables the SSD to achieve outstanding reliability and performance.
Sustained reads at up to 550MB/s (SATA-III) / 270MB/s (SATA-II) and
sustained writes at up to 505MB/s (SATA-III) / 250MB/s (SATA-II), are
the best in its class. The Wintec Synchronous Flash Solid State Drives
are best utilized on uncompressed data systems to provide impressive
sequential and random performances.
TM
With the proprietary DuraClass technology, the SF-2281 controller
implements superior wear-leveling techniques and minimizes data write
amplification to ensure that the NAND flash memory is not worn out
prematurely. The controller also overcomes the flash memory
‘Read Disturb’ issues by tracking reads and refreshes data in proximity
before the data is negatively impacted. The controller utilizes 55
TM
bits/512 byte sector BCH ECC algorithms and embedded RAISE
Internal redundant array to provide the protection and reliability of
RAID on a single disk without any write overhead penalty to the host.
Combining intelligent bad block management, wear leveling
management, read disturb management, block consolidation and
recycling, automatic data compression, AES-128 encryption, and
multiple data hardening technologies, the Wintec SF-2281 series SSD
guarantees maximum reliability and longevity of the SSD.
*
Available capacities vary based on the Flash Type and drive
configuration
General Features
 Density up to 240GB
 SandForce SF-2281 controller with internal cache
buffer
 SATA-III (6.0 Gbps) interface
 SATA-II (3.0 Gbps) backwards compatible
 High-Performance Synchronous SLC or MLC
NAND Flash memory
Reliability
TM
 Data Integrity protection featuring DuraClass
Technology
 Intelligent Block Management & Wear Leveling
 Intelligent Data Retention optimization
 Powerful ECC Engine: Up to 55 bits correctable
per 512B sector
 Automatic encryption (AES-128) and optional
password security
 MTTF: 1,000,000 operating hours
Performance
(SATA-III)
 Compressed Performance 550MB/s Seq. Read
 Compressed Performance 505MB/s Seq. Write
 Random Read: 10,000 IOPS at 4KB transfer
 Random Write: 7,000 IOPS at 4KB transfer




(SATA-II)
Compressed Performance 270MB/s Seq. Read
Compressed Performance 250MB/s Seq. Write
Random Read: 8,000 IOPS at 4KB transfer
Random Write: 5,000 IOPS at 4KB transfer
Compatibility
 Serial ATA Revision 2.6 Compliant
 ATA/ATAPI-7 Compliant
 Supports TRIM and S.M.A.R.T command
Transport
 Windows Logo Certification
NOTE:
1. See Section 5.0 for Configuration & Ordering Guide
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Revision History
Revision
Month
Year
History
1.0
December
2013
Initial release
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Table of Contents
1.0
2.0
3.0
4.0
5.0
General Product Specifications
5
1.1
Block Diagram
6
1.2
Architecture
6
1.3
Queue Depth
6
1.4
Data compression and write amplification ion
6
1.5
AE-128 Data Encryption and Secure Erase
6
1.6
Read disturb data loss mitigation
7
1.7
Flash cell wear leveling
7
1.8
Error correction and data integrity
7
1.9
Block recycling and Garbage collection
7
1.10
TRIM Support
7
Electrical Specifications
8
2.1
General
8
2.2
SATA P in Assignment and Description
8
Software Interface
9
3.1
ATA Command Set
9
3.2
SMART Command Support
11
3.2.1
SMART Attribute Sector
12
3.2.2
Supported SMART Attributes
12
Physical Specifications
14
4.1
14
Physical Specifications
Product Guide & Ordering Information
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1.0 General Product Specifications
For all the following specifications, values are defined at ambient temperature unless otherwise stated.
Table 1: User Capacity Specifications
Model Number¹ (typ) 2,3
WvES032G1TA-D41wxx-yyy.zz
WvES060G1TA-D41wxx-yyy.zz
W2ES080G1TA-D41wxx-yyy.zz
W2ES120G1TA-D41wxx-yyy.zz
W2ES240G1TA-D41wxx-yyy.zz
NAND Flash
SLC/MLC
Type
SLC/MLC
MLC
MLC
MLC
NAND Flash Total Capacity (user) Over-provision4
32 GB (32GB)
64 GB (60GB)
96 GB (80GB)
128 GB (120GB)
256 GB (240GB)
0%
7%
16
%
7%
7%
Note:
1. See Section 5.0 for Configuration & Ordering Guide
2. 1GB = 1,000,000,000 Bytes
3. Capacity available to end-user is less than “Total Capacity” due to flash controller overhead, and may vary with flash configuration.
4. Over-provision allotted on the drive for controller/flash specific operations.
Table 2: Typical Performance Specifications
Parameter
Typical Performance5,6,7
Sustained Sequential Read (compressed)
Sustained Sequential Write (compressed)
Sustained IOPS Random Read (compressed)
Sustained IOPS Random Write (compressed)
Up to 550MB/s (SATA-III), 270MB/s (SATA-II)
Up to 505MB/s (SATA-III), 250MB/s (SATA-II)
Up to 10,000 IOPS (SATA-III), 8,000 IOPS (SATA-II)
Up to 7,000 IOPS (SATA-III), 5,000 (SATA-II)
Note:
5. Bandwidth measured on high-performance desktop system. Note that performance may also vary depending on host system, drive capacity, and drive
configuration. Measured at QD=32.
6. Performance is based on Sync. SLC drives
7. Compressed performance is measure using ATTO (FOB), IOMeter’08 using QD=32
Table 3: Flash Endurance
Parameter
Spec
Up to 60,000 cycles for SLC*
Up to 3,000 cycles for MLC*
5 Years (Min.)
2,000,000 Hours
Program/Erase Cycles
Data Retention
MTTF
*P/E cycles vary based on specific NAND devices used
Table 4: SSD Data Reliability
Parameter
Spec
Non-Recoverable Errors
< 1 in 10 Bytes Read
Raw ECC Correctability
Up to 55 bits / 512 Bytes data
16
Table 5: Environmental Specifications
Parameter
Temperature
Humidity (Non-Condensing)
Vibration
Shock (Operating)
Noise
Commercial Temp.
Datasheet
Wintec Slim SATA SSD - WxESxxxG1TA-D41xxx
Version 1.0
Operating
Non-Operating
0C to 70C
5% to 95%
20 G RMS
1,500 G (Max.)
0 dB
-55C to 95C
5% to 95%
N/A
0 dB
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1.1 Block Diagram
FLASH 0
Quad 0
Controller_A
SATA-III/II
Q0 Interface
FLASH 1
SF-2281
Quad 0
Controller_B
FLASH 2
Q1 Interface
FLASH 3
Figure 1: Block Diagram
1.2 Architecture
The Wintec SF-2281 series SSD utilizes a single flash controller chip with 4 parallel channels of flash memory interface. The flash
controller also simultaneously manages the file read and write interface with the host system via a single SATA-III/II interface. By utilizing
4 parallel channels of SLC flash memory, combined with internal NAND die redundancy, the Wintec SSD can provide both high
performance and reliability, while maintaining a minimal unit cost. While other SSDs rely only upon the ECC spare area within the NAND
chips to correct inevitable bit errors within the data, the SF-2281 series SSD has additional error correction mechanisms, and can
maintain data integrity even after complete loss of an entire NAND flash die.
1.3 Queue Depth
In order to maximize the performance potential of the Wintec SF-2281 series SSD, a queue depth of 32 commands is enabled when used
in AHCI mode. This allows multi-threaded disk IO requests from the host to be serviced in parallel within the drive, as well as combining
small write requests in the SF-2281 controller’s internal buffer to minimize write amplification effects.
1.4 Data compression and Write amplification
The SF-2281 series SSD contains an internal data compression algorithm that is processed inside the controller’s internal processing
buffer. The internal cache buffer allows for efficient data compression without any involvement from the host or user. This data
compression allows for the actual amount of data written to the flash cells to be less than the data written to the drive from the host,
greatly extending the reliability and lifetime of the drive beyond our competitors’ SSD products.
1.5 AES-128 Data Encryption and Secure Erase
Upon initialization of the SF-2281 series SSD, an internal randomly generated AES-128 encryption key is generated in the controller. This
encryption key is not externally accessible, which ensures integrity of the encryption key and the data that it protects. This key is then
used to encrypt all data being written to the flash. Only encrypted data is written to the physical NAND flash chips, which ensures that
any data pulled straight from the NAND flash chips is undecipherable to unauthorized parties. When an ATA Secure Erase command is
sent to the drive, the controller erases and resets the internal encryption key, rendering the data in the NAND flash undecipherable. The
data allocation map data, all LBAs and SMART logs are also erased. The Secure Erase process takes less than 4 seconds to complete,
regardless of capacity. After the Secure Erase is completed, the drive is still functional, but the old existing data is unrecoverable.
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1.6 Read disturb data loss mitigation
In typical flash read situations, reading of data in nearby cells will cause an accelerated loss of charge from neighboring flash storage cells.
The SF-2281 series SSD tracks the number of reads to locations within the flash and will dynamically move data that is at a higher risk of
error accumulation and data loss. If other SSD solutions do not actively manage for read disturb effects, this will lead to much shorter
data retention times.
1.7 Flash cell wear leveling
The SSD tracks the number of PE (program/erase) cycles that each block in the SSD goes through, and will dynamically remap logical
sectors written from the host to different physical pages and blocks within the NAND flash memory. This ensures that the flash cells will
wear evenly, and that no premature wear out or data loss will occur in any portions of the drive.
1.8 Error correction and data integrity
The SF-2281 series SSD incorporates multiple levels of error correction and data redundancy to maintain data integrity. The SF -2281
series uses ECC correction from the spare area on the NAND itself, a dedicated redundant NAND flash die for parity information, a s well
as a data path CRC check to ensure that data errors are detected and correctable. The redundant NAND flash die can maintain data
integrity even after the loss of an entire NAND die. These multiple error detection and correction mechanisms allow the SF -2281 series
SSD to maintain lower Uncorrectable Bit Error Rates (UBER) than traditional HDD drives, throughout their entire service lifetime.
1.9 Block recycling and Garbage collection
As data is written to the SSD from the host, the Logical LBAs do not match with the page or erase block sizes within the NAND flash chips,
which means that as the user data fills the drive there is always some amount of data fragmentation or non-contiguous logical LBA
mapping to adjacent flash cells. This also means that invalid data is mixed into a block with valid data. By moving and combining valid
data from multiple blocks within the device, and then writing that data to an empty block, free space can be made into whole free blocks.
This maximizes performance within the SF-2281 series SSD, and is done internally within the drive.
1.10 TRIM Support
The SF-2281 series SSD supports the TRIM command. Data that has been deleted from the host can be marked as free space by the host
issuing the TRIM command to the drive. This allows the drive to more efficiently reclaim free space and maintain performance.
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2.0 Electrical Specification
2.1 General
Table 6: Absolute Maximum Ratings
Symbol
Parameter
Min
Max
Units
Vcc
Vcc With Respect to GND
-0.5
6.0
V
Table 7: Typical Operating Conditions (VCC=5V  10%)
Symbol
Parameter
Min
Max
Units
Vcc
Vcc With Respect to GND
Operating Temperature
(Commercial Temp)
Humidity
4.5
5.5
V
0
70
C
5
95
%
TA
H
Table 8: Power Consumption
Symbol
Parameter
Value
Units
Pi
PT
Pmax
Idle Power consumption
Typical operating power consumption
Maximum operating power consumption
0.3
1.9
2.1
Watts
Watts
Watts
2.2 SATA Pin Assignment and Description
The SATA connectors are compliant with standard SATA power specifications. As is standard, power may be supplied to all of the power
pins. However, only the 5V power pins are utilized to provide power to the SSD. Therefore, where non -standard power supplies and
connections are utilized, the power supply does not need to supply the SSD with power to the 3.3V or 12V power pins.
Table 9: SATA Pin Assignment
No.
Plug Connector
Signal
S1
S2
S3
S4
S5
S6
S7
GND
A+
AGND
BB+
GND
Pin Definition
Ground
Differential signal A
Ground
Differential signal B
Ground
Key and spacing separate signal and power segments
Power
P1
P2
P3
P4
P5
P6
P7
P8
P9
P10
P11
P12
P13
P14
P15
V33
V33
V33
GND
GND
GND
V5
V5
V5
GND
DAS/DSS
GND
V12
V12
V12
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3.3V power (Not Used)
3.3V power (Not Used)
3.3V power, pre-charge (Not Used)
Ground
Ground
Ground
5V power, pre-charge
5V power
5V power
Ground
Device Present
Ground
12V power, pre-charge (Not Used)
12V power (Not Used)
12V power (Not Used)
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3.0 Software Interface
3.1 ATA Command Set
The Wintec Industries SSD drive complies with ATA-8/ACS-2. All mandatory, and many optional commands and features are supported.
The following tables summarize the ATA feature set and commands.
Table 10: ATA Feature Set
Feature Set
General feature set
48-Bit Address feature set
General Purpose Logging (GPL) feature set
Host Protected Area (HPA) feature set
Native Command Queuing (NCQ) feature set
Power Management feature set
Advanced Power Management (APM) feature set
Power-Up In Standby (PUIS) feature set
Security feature set
S.M.A.R.T feature set
Software Settings Preservation (SSP) feature set
Write-Read-Verify feature set
ATA-8 Reference
4.2
4.4
4.10
4.11
4.15
4.18
4.5
4.19
4.20
4.21
4.22
4.26
Mandatory/Optional
M
O
O
O
O
M
O
O
O
O
O
O
Table 11: ATA Command
Command
General Feature Set
NOP
Data Set Management EXT ( I.E. TRIM)
Recalibrate
Read Sector(s)
Read Sector(s) w/o retry
Read Long
Read Long w/o retry
Read Sector(s) EXT
Read DMA EXT
Read Native Max Address EXT
Read Multiple EXT
Read Log EXT
Write Sector(s)
Write Sector(s) (w/o retry)
Write Long
Write Long w/o retry
Write Sector(s) EXT
Write DMA EXT
Set Max Address EXT
Write Multiple EXT
Write DMA FUA EXT
Write Log EXT
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OpCode
00h
06h
10h
20h
21h
22h
23h
24h
25h
27h
29h
2Fh
30h
31h
32h
33h
34h
35h
37h
39h
3Dh
3Fh
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Read Verify Sector(s)
Read Verify Sector(s) (w/o retry)
Read Verify Sector(s) EXT
Read Log DMA EXT
Write Log DMA EXT
Read FPDMA Queued
Write FPDMA Queued
SEEK
Execute Device Diagnostic
Initialize Device Parameters
Download Microcode
Download Microcode DMA
Read Multiple
Write Multiple
Set Multiple Mode
Read DMA
Read DMA (w/o retry)
Write DMA
Write DMA (w/o retry)
Write Multiple FUA EXT
Read Buffer
Flush Cache
Write Buffer
Flush Cache EXT
Identify Device
Set Feature [Enable/Disable - Write Cache, Look-ahead, Automatic
Acoustic mgmt., Reverting to power-on defaults, DMA setup FIS autoactivate optimization, Device-initiated interface power state transitions, software settings preservations] Set
transfer mode ( based on value in sector count register)
Power Management Feature Set
Standby Immediate
Idle Immediate
Standby
Idle
Check Power Mode
Sleep
Security Mode Feature Set
Security Set Password
Security Unlock
Security Erase Prepare
Security Erase Unit
Security Freeze Lock
Security Disable Password
S.M.A.R.T Feature Set
SMART Execute Off-Line Routine
SMART Execute Short Self-test Routine
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40h
41h
42h
47h
57h
60h
61h
70h
90h
91h
92h
93h
C4h
C5h
C6h
C8h
C9h
CAh
CBh
CEh
E4h
E7h
E8h
EAh
ECh
EFh
E0h
E1h
E2h
E3h
E5h
E6h
F1h
F2h
F3h
F4h
F5h
F6h
B0h
B0h
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SMART Execute Extended Self-test Routine
SMART Execute Selective Self-test Routine
SMART Abort Off-Line Routine
SMART Execute Short Self-test Routine (captive)
SMART Execute Extended Self-test Routine (captive)
SMART Execute Selective Self-test Routine (captive)
SMART Execute Conveyance Self-test Routine (offline)
SMART Execute Conveyance Self-test Routine (captive)
SMART SCT ( SMART Command transport) Command/Status
SMART Data Transfer
SMART SCT Control: Forced Write Cache Enable/Disable
SMART SCT Data Tables: Read Table:(HAD)Temperature History
SMART Read Data
SMART Enable/Disable Autosave
SMART Execute Off-line Immediate
SMART Read Log
SMART Write Log
SMART Enable Operations
SMART Disable Operations
SMART Return Status
SMART Read Threshold
SMART Save ATB Threshold
Host Protected Area Feature Set
B0h
B0h
B0h
B0h
B0h
B0h
B0h
B0h
B0h
B0h
B0h
B0h
B0h/D0h
B0h/D2h
B0h/D4h
B0h/D5h
B0h/D6h
B0h/D8h
B0h/D9h
B0h/DAh
B0h/D1h
B0h/D3h
Read Native Max Address
Read Native Max Address EXT
Set Max Address
Set Max Address EXT
Set Max Set Password
Set Max Lock
Set Max unLock
Set Max Freeze Lock
F8h
27h
F9h
37h
F9h/01h
F9h/02h
F9h/03h
F9h/04h
3.2 SMART Command Support
The Wintec Industries SSD drive supports SMART command Set is used to define some vendor -specific data to report spare/bad block
numbers in each memory management unit.
Table 12: SMART Command Set
Value
Command
Value
Command
00-CF
D0h
D1h*
D2h
D3h*
D4h
D5h
Reserved
Read Data attributes
Read attribute Threshold
Enable/Disable attribute autosave
Save attribute Values
Execute OFF-LINE Immediate
Read Log sector
D6h
D7h*
D8h
D9h
DAh
DBh
DC-FFh
Write Log sector
Write attribute threshold
Enable SMART operation
Disable SMART operation
Smart Return Status
Enable / disable automatic off-line
Reserved
*Note the D1, D3, and D7 are supported, but have been made obsolete in the ATA -8/ACS-2 specifications
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3.2.1 SMART Attribute Sector
The following 512 bytes defines the SMART format. Users can obtain the data using the “Read Data” command.
Table 13: SMART Attribute Data Structure
Byte
0-1
2
3-4
5
6
7-12
13
14-25
26-361
362
363
364-365
366
367
368-369
370
371
372
373
374
375-376
377-385
386-510
511
Description
SMART structure version code
1st Stored Attribute Number
Status
Nominal value
Worst value since SSD was deployed
Raw Data
Reserved
Next Stored Attribute Number
Next Stored Attribute Numbers
Off-line data collection status
Self-test execution status byte
Total time in seconds to complete off-line data collection activity
Reserved
Off-line data collection capability
SMART capability
Error Logging capability

bit 0 1 = Device error logging supported
Next Self-Test Step
Short self-test routine recommended polling time ( in minutes)
Extended self-test routine recommended polling time ( in minutes)
Conveyance self-test routine recommended polling time ( in minutes)
Time for Extended Self-Test if > 255 ( ie, 373 to FFh)
Reserved
Vendor specific
Checksum of Data structure ( generated on retrieval of stored data )
3.2.2 Supported SMART Attributes
The following table summarizes the SMART attribute Menu.
Table 14: SMART Attribute Menu Summary
ID
Hex
Attribute Name
Description
1
01h
Raw Read Error Rate
5
9
12
171
172
174
05h
09h
0Ch
ABh
ACh
AEh
Retired Block Count
Power-On Hours (POH)
Device Power Cycle Count
Program Fail Count
Erase Fail Count
Unexpected Power loss count
177
B1h
Wear Range Delta
181
182
B5h
B6h
Program Fail Count
Erase Fail count
Raw error rate related to ECC errors. Correctable and uncorrectable errors are
included in error event count
Tracks the total number of retired blocks.
Total count of hours in power-on state.
The count of full disk power on/off cycles.
Counts the number of flash program failure
Counts the number of flash erase failure
Counts the number of unexpected power loss events since the drive was
deployed
Return the percent difference in wear between the most-worn block and leastworn block
(Identical to attribute 171)
(Identical to attribute 172)
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187
BBh
Reported Uncorrectable Errors
194
195
C2h
C3h
196
C4h
Temperature
On-the-fly ECC Uncorrectable Error
Count
Reallocation Even Count
201
C9h
Uncorrectable Soft Read Error Rate
204
230
CCh
E6h
Soft ECC correction Rate
Life Curve Status
231
233
234
241
E7h
E9
EA
F1h
SSD Life left
Internal Reserved (LSI)
Internal Reserved (LSI)
Lifetime Writes from Host
242
F2h
Lifetime Reads from Host
This attribute tracks the number of uncorrectable errors reported back to the
host for all data access commands
Reads the temperature in degrees C
This attribute tracks the number of uncorrectable errors. (UECC)
This attribute tracks the number of blocks that fail programming which are
reallocated as a result
Number of soft read errors that cannot be fixed on-the-fly and requires deep
TM
recovery via RAISE (ieUECC)
TM
Number of errors corrected by RAISE
A life curve used to help predict life in terms of the endurance based on the
number of writes to flash
Indicates the approximate percentage of SDD life left
Reserved for Controller Vendor
Reserved for Controller Vendor
Indicates the total amount of data written from hosts since the drive was
deployed
Indicates the total amount of data read to hosts since the drive was deployed
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4.0 Physical Specifications
4.1 Physical Specifications
Table 15: Physical Specifications
Common Dimensions (mm)
Symbol
A
B
C
D
E
F
G
H
I
Min
53.85
2.15
3.85
Nom
39.00
54.00
49.40
25.00
2.30
0.80
33.39
4.00
Max
54.15
2.45
4.00
4.15
Figure 2: Physical Dimensions
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5.0 Ordering Information
Table 17: Product Availability List & Naming
Model Number
WvES032G1TA-D41wxx-yyy.zz
WvES060G1TA-D41wxx-yyy.zz
W2ES080G1TA-D41wxx-yyy.zz
W2ES120G1TA-D41wxx-yyy.zz
W2ES240G1TA-D41wxx-yyy.zz
Nand Flash Type
SLC/MLC
SLC/MLC
MLC
MLC
MLC
(v) Flash Manufacturer and type
2: MLC
7: SLC
(w) Flash Manufacturer and type
Contact the factory/Sales Rep. for the latest
Flash MFG
Overprovision
User Capacity (typ)
0%
7%
16%
7%
7%
32GB
60GB
80GB
120GB
240GB
(yyy) Component Flash type
2D2: 2-Nand, Dual Die Package, 2-CE
4Q2: 4-Nand, Quad Die Package, 2-CE
4D2: 4-Nand, Dual Die Package, 2-CE
4Q4: 4-Nand, Quad Die Package, 4-CE
(zz) Firmware Revision
Contact the factory for the latest firmware rev. and/or
custom labeling and programming identification.
(xx) Die Revision and Process
Contact the factory/Sales Rep for the latest
Datasheet
Wintec Slim SATA SSD - WxESxxxG1TA-D41xxx
Version 1.0
12/17/2013
www.wintecind.com
Page 15
Contact Us (US & Int’l)
Wintec Industries OEM Sales
675 Sycamore Drive
Milpitas, CA 95035
Ph: 408-856-0500
Fax: 408-856-0501
oemsales@wintecind.com
http://www.wintecind.com/oem
About Wintec Industries, Inc.:
Wintec Industries, founded in 1988, is headquartered in Milpitas, California. Wintec, an ODM/OEM solution provider,
specializes in product designs and manufacturing, including Flash modules (CF, SD, USB, embedded Flash, SSD, etc), DRAM
modules (RDIMM, SODIMM, UDIMM), wireless products, modem products (embedded and USB), Advanced Digital Display
products (ADD2 DVI, HDMI, digital signage), and so on. With experienced engineering team in Silicon Valley, Wintec
provides a wide range of services and solutions for customers. Wintec is ISO9001-2000 certified.
Important Notice:
Wintec Industries makes no representations or warranties with respect to the contents of this datasheet and specifically
disclaims any implied warranties of any product design for any particular purpose. Wintec Industries reserves the rights to
revise this publication and to make changes from time to time in the content hereof without obligation of Wintec Industries
to notify any person or organization of such revisions or changes.
Datasheet
Wintec Slim SATA SSD - WxESxxxG1TA-D41xxx
Version 1.0
12/17/2013
www.wintecind.com
Page 16