SmartSite RS_brochure_en_Ver2_2014.10.03.indd

SmartSite RS
Field X-ray instrument
Portable stress analyzer
The World’s Smallest Stress Analyzer
SmartSite RS
Head unit(bottom right)
Power supply unit (back)
Tablet PC for operation (bottom left)
†As of August 2014
Unique Features
The world’s smallest instrument
Remote operation through a tablet
PC and Wi-Fi
The world’s smallest measurement head is 114(W) x 248(D)
x 111(H) mm and weighs 3 kg. It enables measurement of
residual stress in the inner surface of 200 mmpipe.
The instrument is remotely controlled by a tablet PC with Wi-Fi
Rapid data acquisition
Built-in utilities
A high-speed 2-dimensional semiconductor detector and
single-exposure method accelerates data acquisition. Residual
stress is measured in 60 seconds or less in most cases.
The instrument is powered by an optional exchangeable
battery. There is no need to have utilities in field, e.g. cooling
liquid and electricity.
2-D detectors
diffraction ring
Application Examples
Residual stress measurement on shot peened steel
The shot peening process creates high
residual stress at the peened area. A
shot peened steel sample was aligned
by monitoring an image displayed on a
tablet PC as recorded by an integrated
CCD camera with the aid of a laser marker (See Figure 1 and the next page for
sample alignment details). Predefined
material and measurement parameters
were used for evaluation. A DebyeScherrer diffraction ring of -Fe 211
was recorded by the 2-dimensional
semiconductor detector (Figure 2).
Exposure time was 60 seconds. Principal
stresses 1 and 2 were calculated and
displayed with the sample image taken
by the CCD camera (Fig. 3). Residual
stress 11 and its share component 12
were calculated as -1278.9 and -46.1
MPa, respectively (Fig. 4). These data,
including the sample image and DebyeScherrer diffraction ring, are stored and
summarized in a report.
Figure 1. Arrangement of head unit and sample
Figure 2. A 2-D Debye-Scherrer diffraction ring
of -Fe 211 diffraction
Figure 3. Stress principal axes (1, 2)
and sample coordinate (X, Y)
Figure 4. Residual stress analysis result
Sample type
Typical sample types for residual stress
measurement are summarized in the
table. Other steel samples can also be
measured. The sample shape is arbitrary:
thanks to the device’s compact design,
sheets, bulk materials, springs, gears and
pipes can be measured without major
sample preparation.
Examples of sample type
Shot peening
Multistage shot peening
High-hardness shot peening
Fine shot peening
Plastic working
General heat treatment
Surface heat treatment
High-frequency hardening
Grinding and polishing
Surface reforming
Maintenance of plant and infrastructure
Warm shot peening
Stress shot peening
Easy Alignment and Measurement
CCD sample observation camera and laser marker
The measured point on the sample
surface is indicated by a laser marker
and is displayed on the tablet PC. White
LEDs illuminate the sample for low-light
work environments, e.g. inside a pipe.
Sample image is stored together with
measurement data and attached to the
Sample alignment using sensors
The distance to the sample surface and
the incident angle of the X-rays are
measured by a laser displacement
sensor as well as 3-dimensional (3D)
accelerometer and displayed on the
tablet PC. An operator is able to adjust
these parameters easily by following
indicators on the display.
Single-click measurement and analysis
Measurement setup is easy. For daily use, the operator simply selects the type of
application on the tablet PC and carries out the measurement. From data collection
to reporting, all of the procedures are done by single-click operations.
For the expert user, detailed measurement and analysis conditions are editable
through the instrument control software. An expert user can also edit material
parameters in recipes for residual stress calculation.
Material-related parameters for each
phase (e.g., Young’s modulus, Poisson’s
ratio, Bragg angle of diffraction) are
pre-installed in the instrument
control software. Options for the
residual stress calculation are selectable with regards to stress model, LPA
(Lorentz-polarization and absorption)
correction, wavelength component
and BG (background) mode. Those
parameters are saved as recipes together with measurement conditions.
Safety and Traceability
Safety is our top priority
This portable device is designed for field analysis, and
can be used in open space environments. Integrated
laser displacement sensor and three-dimensional (3D)
accelerometer measure distance to the sample and the
position of the device. Unless those parameters are set
properly, X-rays cannot be illuminated onto the sample. The
multiple step safety algorithm protects the operator from
exposure to radiation.
For indoor laboratory use, an optional radiation enclosure
is available. It ensures a safe operational environment in the
Calibration standards for measurement traceability
Measurement traceability is maintained by means of
periodic calibration. SmartSite RS is delivered with instrument
calibration standards, including steel powder, bulk steel and
fluorescence powder. The steel powder calibrates “zero”
stress and the absolute scale of residual stress is ensured by
measuring the bulk steel sample, which has approximately -100
MPa of residual stress. Location and size of the X-ray spot on a
sample is determined using the fluorescence powder standard.
Calibration records can be recalled at any time from the
history view. This assures the measurement traceability
of the instrument.
Head unit (excluding ball joint)
114 x 248 x 111 mm, 4.5 x 9.8 x 4.4 inch (W x D x H)
approximately 3 kg, 6.6 lbs
Power supply unit
230 x 470 x 460 mm, 9.1 x 18.5 x 18.1 inch (W x D x H)
approximately 20 kg, 44.1 lbs
1x carrying case included
High voltage cable
Storage for transportation
Residual stress measurement
Materials to be measured
Residual stress calculation
Stress component
X-ray tube
X-ray incident angle
X-ray beam size
Measurement time
X-ray detector
X-ray detector size
2 range
Sample-detector distance
Steel, aluminum (optional)
General equation (Rigaku original)
Biaxial stress
Chromium radiation (Cr), 30 kV - 50 W
1 mm (with collimator), 2 mm (without collimator)
approximately 60 seconds
High-speed semiconductor 2-dimensional detector
2x (38.5 x 19.3 mm)
145° ~ 165°
45 mm
Windows 8.1 tablet PC
Wireless (Wi-Fi)
Environment, Utility, Safety
Temperature range
Humidity range
Power supply
Safety mechanism
Dust resistance
-10 ~ +50°C with less than ±4°C fluctuation
1 ~ 70 % R.H. with less than ±10 % R.H. fluctuation
AC 100 - 240V or optional built-in battery
Safety mechanism by three-dimensional (3D) acceleration and laser displacement
sensors, emergency stop switch, safety key
SmartSite RS
Field X-ray instrument
Rigaku Corporation and its Global Subsidiaries
website: | email:
SmartSite RS_brochure_en_Ver2_2014.10.03
Copyright © 2014. Rigaku Corporation. All rights reserved.
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