Intel® Solid-State Drive DC S3510 Series

Capacity:

− 80GB, 120GB , 240GB, 480GB, 800GB,
1.2TB, 1.6TB



Form Factor: 2.5–inch
Read and Write IOPS1,2
(Full LBA Range, IOMeter* Queue Depth 32)
−
−
−
−

−
−
−
−
Components:
− 16nm NAND Flash Memory
− Standard Endurance Technology (SET)
Multi-Level Cell (MLC)
Random 4KB3 Reads: Up to 68,000 IOPS
Random 4KB Writes: Up to 20,000 IOPS
Random 8KB3 Reads: Up to 46,000 IOPS
Random 8KB Writes: Up to 10,000 IOPS



Latency (average sequential)
− Read: 55 µs (TYP)
− Write: 66 µs (TYP)

Quality of

Performance Consistency7,8
− Read/Write: Up to 95%/95% (99.9%)

AES 256-bit Encryption
Altitude9



Product Ecological Compliance

Compliance
− RoHS*
− SATA Revision 3.0; compatible with SATA 6Gb/s, 3Gb/s
and 1.5Gb/s interface rates
− ATA/ATAPI Command Set – 2 (ACS-2 Rev 7);
includes SCT (Smart Command Transport)
and device statistics log support
− Enhanced SMART ATA feature set
− Native Command Queuing (NCQ) command set
− Data set management Trim command
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
Weight:
Temperature
Operating: 0° C to 70° C
Non-Operating13: -55° C to 95° C
Temperature monitoring and logging
Thermal throttling
Shock (operating and non-operating):
1,000 G/0.5 ms

Vibration
− Operating: 2.17 GRMS (5-700 Hz)
− Non-Operating: 3.13 GRMS (5-800 Hz)

Reliability
− Uncorrectable Bit Error Rate (UBER):
1 sector per 10^17 bits read
− Mean Time Between Failures (MTBF): 2 million hours
− End-to-End data protection
Service6,8
− Operating: -1,000 to 10,000 ft
− Operating10: 10,000 to 15,000 ft
− Non-operating: -1,000 to 40,000 ft
Power12
−
−
−
−
− Read/Write: 500 µs / <5 ms (99.9%)

5V or 5V+12V SATA Supply Rail11
SATA Interface Power Management
OS-aware hot plug/removal
Enhanced power-loss data protection feature
− 80GB, 120GB, 240GB, 480GB: 82 grams ± 2 grams
− 800GB: 88 grams ± 2 grams
− 1.2TB, 1.6TB: 94 grams ± 2 grams
Bandwidth Performance1
Endurance: 0.3 drive writes per day5 for 5 years
− 80GB: 45TBW
– 120GB: 70TBW
− 240GB: 140TBW
– 480GB: 275TBW
- 800GB: 450TBW
– 1.2TB: 660TBW
- 1.6TB: 880TBW
Product Specification
− Active: Up to 6.8 W8 (TYP) 2.5”
− Idle: 600 mW
− Sustained Sequential Read: Up to 500 MB/s4
− Sustained Sequential Write: Up to 460 MB/s

Power Management

Certifications and Declarations
− UL*, CE*, C-Tick*, BSMI*, KCC*, Microsoft* WHCK, VCCI*,
SATA-IO*

Compatibility
− Windows 7* and Windows 8*, and Windows 8.1*
− Windows Server 2012* R2
− Windows Server 2012*
− Windows Server 2008* Enterprise 32/64bit SP2
− Windows Server 2008* R2 SP1
− Windows Server 2003* Enterprise R2 64bit SP2
− VMWare* 5.1, 5.5
− Red Hat* Enterprise Linux* 5.5, 5.6, 6.1, 6.3, 7.0
− SUSE* Linux* Enterprise Server 10, 11 SP1
− CentOS* 64bit 5.7, 6.3
− Intel® SSD Toolbox with Intel® SSD Optimizer
Performance values vary by capacity
Performance specifications apply to both compressible and incompressible data
4KB = 4,096 bytes; 8KB = 8,192 bytes.
MB/s = 1,000,000 bytes/second
Based on JESD218 standard.
Based on Random 4KB QD=1 workload, measured as the time taken for 99.9 percentile of commands to finish the round-trip from host to drive and back to host
Based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile slowest 1-second interval)/(average IOPS during the test)
Measurement taken once the workload has reached steady state but including all background activities required for normal operation and data reliability
Altitude pressure is simulated in a test chamber; excludes soft error
Extended operation at a higher altitude might impact reliability.
If both 12V and 5V power supplies are present, defaults to 5V+ 12V power supplies. Does not support 12 volt only.
Based on 5Vpower supply
Order Number: 332211-002US
Intel® Solid-State Drive DC S3610 Series
13.
Please contact your Intel representative for details on the non-operating temperature range
Revision History
Revision
001
Description
Initial release.
•
002
•
Product Specification
2
Date
May 2015
Table 15, SMART Attributes:
-
SMART Attribute EAh - added bytes description
-
Added new SMART Attribute F3h description and status flags
July 2015
Section 5.4.2: Updated SMART Attribute E2h decimal precision points
from 3 to 2
July 2015
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Intel® Solid-State Drive DC S3510 Series
Ordering Information
Contact your local Intel sales representative for ordering information.
Intel may make changes to specifications and product descriptions at any time, without notice. Designers must not rely on the
absence or characteristics of any features or instructions marked "reserved" or "undefined." Intel reserves these for future definition
and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them. The information
here is subject to change without notice. Do not finalize a design with this information.
Tests document performance of components on a particular test, in specific systems. Differences in hardware, software, or
configuration will affect actual performance. Consult other sources of information to evaluate performance as you consider your
purchase.
System Configuration for all performance testing: Intel® Core™ i7-3960x on Intel® DX79SI desktop motherboard, BIOS Version
0537 – SIX7910J.86A.0537.2012.0723.1217 8GB DDR3 LSI 9265-8i, FW 3.190.25-1776, Intel® SSD DC S3510 FW G2010130
All documented endurance test results are obtained in compliance with JESD218 Standards; refer to individual sub-sections within
this document for specific methodologies. See www.jedec.org for detailed definitions of JESD218 Standards.
The products described in this document may contain design defects or errors known as errata which may cause the product to
deviate from published specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an order number and are referenced in this document, or other Intel literature, may be obtained by
calling 1-800-548-4725, or go to: http://www.intel.com/design/literature.htm.
Intel and the Intel logo are trademarks of Intel Corporation in the U.S. and other countries.
*Other names and brands may be claimed as the property of others.
Copyright © 2015 Intel Corporation. All rights reserved.
July 2015
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Product Specification
3
Intel® Solid-State Drive DC S3510 Series
Contents
Revision History........................................................................................................................................................... 2
Terminology ................................................................................................................................................................. 6
1
Overview....................................................................................................................................................................... 7
2
Product Specifications .............................................................................................................................................. 8
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
Capacity ......................................................................................................................................................................................... 8
Performance ................................................................................................................................................................................ 8
Electrical Characteristics .................................................................................................................................................... 10
Environmental Conditions ................................................................................................................................................. 13
Product Regulatory Compliance ..................................................................................................................................... 13
Reliability ................................................................................................................................................................................... 14
Temperature Sensor ............................................................................................................................................................ 15
Power Loss Capacitor Test ................................................................................................................................................ 15
Hot Plug Support ................................................................................................................................................................... 15
3
Mechanical Information ......................................................................................................................................... 16
4
Pin and Signal Descriptions .................................................................................................................................. 17
4.1
4.2
4.3
5
2.5-inch Form Factor Pin Locations .............................................................................................................................. 17
Connector Pin Signal Definitions .................................................................................................................................... 17
Power Pin Signal Definitions............................................................................................................................................. 18
Supported Command Sets .................................................................................................................................... 19
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
ATA General Feature Command Set ............................................................................................................................. 19
Power Management Command Set............................................................................................................................... 19
Security Mode Feature Set ................................................................................................................................................ 20
SMART Command Set ......................................................................................................................................................... 20
Device Statistics ...................................................................................................................................................................... 25
SMART Command Transport (SCT) ............................................................................................................................... 27
Data Set Management Command Set .......................................................................................................................... 27
Host Protected Area Command Set .............................................................................................................................. 27
48-Bit Address Command Set ......................................................................................................................................... 28
General Purpose Log Command Set............................................................................................................................. 28
Native Command Queuing ................................................................................................................................................ 28
Software Settings Preservation ....................................................................................................................................... 28
6
Certifications and Declarations ............................................................................................................................ 29
7
References ................................................................................................................................................................ 30
Appendix A: IDENTIFY DEVICE Command Data............................................................................................................... 31
Product Specification
4
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Intel® Solid-State Drive DC S3510 Series
Figures
Figure 1:
Intel SSD DC S3510 Series 2.5-inch Dimensions ................................................................................................................. 16
Figure 2:
Layout of 2.5-inch Form Factor Signal and Power Segment Pins ................................................................................ 17
Tables
Table 1:
User-Addressable Sectors .................................................................................................................................................................... 8
Table 2:
2.5 Inch Random Read/Write Input/Output Operations Per Second (IOPS)1 .............................................................. 8
Table 3:
2.5-Inch Random Read/Write IOPS Consistency1 ..................................................................................................................... 9
Table 4:
2.5-Inch Sequential Read and Write Bandwidth1 ..................................................................................................................... 9
Table 5:
2.5-Inch Latency ........................................................................................................................................................................................ 9
Table 6:
Quality of Service 2.5 Inch ................................................................................................................................................................. 10
Table 7:
Operating Voltage for 2.5-inch Form Factor ............................................................................................................................. 10
Table 8:
Power Consumption for 2.5-inch Form Factor (5V Supply)............................................................................................... 11
Table 9:
Power Consumption for 2.5-inch Form Factor (5V + 12V Supply) ................................................................................. 12
Table 10:
Temperature, Shock, Vibration........................................................................................................................................................ 13
Table 11:
Product Regulatory Compliance Specifications ...................................................................................................................... 13
Table 12:
Reliability Specifications ..................................................................................................................................................................... 14
Table 13:
Serial ATA Connector Pin Signal Definitions—2.5-inch and 1.8-inch Form Factors .............................................. 17
Table 14:
Serial ATA Power Pin Definitions—2.5-inch Form Factors ................................................................................................ 18
Table 15:
SMART Attributes .................................................................................................................................................................................. 20
Table 16:
SMART Attribute Status Flags .......................................................................................................................................................... 23
Table 17:
Serial ATA Power Pin Definitions—2.5-inch Form Factors ................................................................................................ 26
Table 18:
Device Certifications and Declarations ........................................................................................................................................ 29
Table 19:
Standards References .......................................................................................................................................................................... 30
Table 20:
Returned Sector Data ........................................................................................................................................................................... 31
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Product Specification
5
Intel® Solid-State Drive DC S3510 Series
Terminology
Term
Definition
ATA
Advanced Technology Attachment
CRC
Cyclic Redundancy Check
DAS
Device Activity Signal
DMA
Direct Memory Access
ECC
Error Correction Code
EXT
Extended
FPDMA
First Party Direct Memory Access
GB
Gigabyte. Note: The total usable capacity of the SSD may be less than the total physical capacity
because a small portion of the capacity is used for NAND flash management and maintenance purposes.
Gb
Gigabit
HDD
Hard Disk Drive
HET
High Endurance Technology
KB
Kilobyte
I/O
Input/Output
IOPS
Input/Output Operations Per Second
ISO
International Standards Organization
LBA
Logical Block Address
MB
Megabyte (1,000,000 bytes)
MLC
Multi-level Cell
MTBF
Mean Time Between Failures
NCQ
Native Command Queuing
NOP
No Operation
PB
Petabyte
PCB
Printed Circuit Board
PIO
Programmed Input/Output
RDT
Reliability Demonstration Test
RMS
Root Mean Square
SATA
Serial Advanced Technology Attachment
SCT
SMART
SSD
SMART Command Transport
Self-Monitoring, Analysis and Reporting Technology. This is an open standard for developing hard drives
and software systems that automatically monitors the health of a drive and reports potential problems.
Solid-State Drive
TB
Terabyte
TYP
Typical
UBER
Product Specification
6
Uncorrectable Bit Error Rate
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Intel® Solid-State Drive DC S3510 Series
1
Overview
This document describes the specifications and capabilities of the Intel® SSD DC S3510 Series.
The Intel SSD DC S3510 Series delivers excellent performance and Quality of Service combined with
high reliability for Serial Advanced Technology Attachment (SATA)-based computers in capacities of
80GB, 120GB, 240GB, 480GB, 800GB, 1.2TB and 1.6TB in a 2.5-inch form factor.
By combining 16nm NAND Flash Memory technology with SATA 6Gb/s interface support, the Intel SSD
DC S3510 Series delivers Sequential Read speeds of up to 500 MB/s and Sequential Write speeds of up
to 460 MB/s. The Intel SSD DC S3510 Series also delivers Random 4k Read speeds of up to 68,000 IOPS
and Random 4K Write speeds of up to 20,000 IOPS, and Quality of Service of 500 µs for random 4KB
reads measured at a queue depth of 1.
The industry-standard 2.5-inch form factors enable interchangeability with existing hard disk drives
(HDDs) and native SATA HDD drop-in replacement with the enhanced performance, reliability,
ruggedness, and power savings offered by an SSD.
Intel SSD DC S3510 Series offers these key features:
•
•
•
•
•
•
•
•
•
•
•
•
July 2015
332211-002US
Standard Endurance Technology
High I/O and throughput performance
Consistent I/O latency
Enhanced power-loss data protection
End-to-End data protection
Thermal throttling
Temperature Sensor
Inrush current management
Low power
High reliability
Temperature monitor and logging
Power loss protection capacitor self-test
Product Specification
7
Intel® Solid-State Drive DC S3510 Series
2
Product Specifications
2.1
Capacity
Table 1:
User-Addressable Sectors
Intel SSD DC S3510 Series
Unformatted Capacity
(Total User Addressable Sectors in LBA Mode)
80GB
156,301,488
120GB
234,441,648
240GB
468,862,128
480GB
937,703,088
800GB
1,562,824,368
1.2TB
2,344,225,968
1.6TB
3,125,627,568
Notes:
1GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is used for NAND flash
management and maintenance purposes.
2.2
Performance
Table 2:
2.5 Inch Random Read/Write Input/Output Operations Per Second (IOPS)1
Specification
Unit
Intel SSD DC S3510 Series
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Random 4KB Read (up to)2
IOPS
68,000
68,000
68,000
68,000
67,000
67,000
65,000
Random 4KB Write (up to)
IOPS
8,400
5,300
10,200
15,100
15,300
20,000
15,200
Random 8KB Read (up to)3
IOPS
41,500
46,000
46,500
46,500
45,000
45,000
44,5000
Random 8KB Write (up to)
IOPS
4,200
2,600
5,000
7,500
7,700
10,000
7,800
Random 4KB
70/30 Read/Write (up to)2
IOPS
22,000
14,500
25,000
32,500
32,000
38,000
32,000
Random 8KB
70/30 Read/Write (up to)3
IOPS
10,500
7,500
13,000
18,000
18,500
23,500
19,000
Notes:
1. Performance measured using IOMeter* with Queue Depth 32. Measurements are performed on a full Logical Block Address (LBA) span of the drive.
2. 4KB = 4,096 bytes
3. 8KB = 8,192 bytes
Product Specification
8
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Intel® Solid-State Drive DC S3510 Series
Table 3:
2.5-Inch Random Read/Write IOPS Consistency1
Specification
Unit
Random 4KB Read (up to)2
Intel SSD DC S3510 Series
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
%
90
92
94
93
95
95
95
Random 4KB Write (up to)
%
95
89
88
85
90
95
92
Random 8KB Read (up to)3
%
90
90
95
95
94
95
93
Random 8KB Write (up to)
%
88
80
72
86
96
92
88
Notes:
1. Performance consistency measured using IOMeter* based on Random 4KB QD=32 workload, measured as the (IOPS in the 99.9th percentile
slowest 1-second interval) / (average IOPS during the test). Measurements are performed on a full Logical Block Address (LBA) span of the drive
once the workload has reached steady state but including all background activities required for normal operation and data reliability
2. 4KB = 4,096 bytes
3. 8KB = 8,192 bytes
Table 4:
2.5-Inch Sequential Read and Write Bandwidth1
Specification
Intel SSD DC S3510 Series
Unit
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Sequential Read (SATA 6Gb/s) 1
MB/s
375
475
500
500
500
500
500
Sequential Write (SATA 6Gb/s) 1
MB/s
110
135
260
440
460
440
430
Note:
1. Performance measured using IOMeter* with 128KB (131,072 bytes) of transfer size with Queue Depth 32.
Table 5:
2.5-Inch Latency
Intel SSD DC S3510 Series
Specification
80GB, 120GB, 240GB,400GB
800GB/1.2TB/1.6TB
Read
55 µs
55 µs
Write
66 µs
66 µs
Power On to Ready2
5.0 s
7.0 s
Latency (TYP)1
Notes:
1. Device measured using IOMeter*. Latency measured using 4KB (4,096 bytes) transfer size with Queue Depth equal to 1 on a sequential workload.
2. Power On To Ready time assumes proper shutdown. Time varies if shutdown is not preceded by STANDBY IMMEDIATE command.
For 95% of the time, the maximum time for power on to ready will be less than 15 seconds.
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Product Specification
9
Intel® Solid-State Drive DC S3510 Series
Table 6:
Quality of Service 2.5 Inch
Intel 2.5-inch SSD DC S3510 Series
Specification
Queue Depth=1
Unit
Queue Depth=32
80GB/
120GB
240GB/
480GB
800GB/1.2TB/
1.6TB
80GB/
120GB
240GB/
480GB
800GB/1.2TB/
1.6TB
Quality of Service1,2
(99.9%)
Reads
ms
<500 µs
<500 µs
<500 µs
<5
<2
<2 /<2 /<5
Writes
ms
<5
<2
<1 /<500 µs/<1
<15
<10
<10 /<5 /<10
Reads
ms
<5
<5
<2 /<5 /<2
<5
<5
<5 /<5 /<10
Writes
ms
<15
<10
<5
<20
<15
<15 /<15 /<20
Quality of Service1,2
(99.9999%)
Notes:
1. Device measured using IOMeter*. Quality of Service measured using 4KB (4,096 bytes) transfer size on a random workload on a full Logical Block
Address (LBA) span of the drive once the workload has reached steady state but including all background activities required for normal operation
and data reliability.
2.
Based on Random 4KB QD=1, 32 workloads, measured as the time taken for 99.9(or 99.9999) percentile of commands to finish the round-trip
from host to drive and back to host.
2.3
Electrical Characteristics
Table 7:
Operating Voltage for 2.5-inch Form Factor
Intel SSD DC S3510 Series
Electrical Characteristics
200GB, 400GB, 480GB, 800GB, 1.2TB, 1.6TB
5V Operating Characteristics:
Operating Voltage range
Inrush Current (Typical Peak) 1
5V (±5%)
1.2A for the first 1s
12V Operating Characteristics:
Operating Voltage range
Inrush Current (Typical Peak) 1
12V (±10%)
1.2A for the first 1s
Note:
1.
Measured from initial device power supply application.
Product Specification
10
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Intel® Solid-State Drive DC S3510 Series
Table 8:
Power Consumption for 2.5-inch Form Factor (5V Supply)
Intel SSD DC S3510 Series
Specification
Unit
80GB
120GB
240GB
480GB
800GB
1.2TB
1.6TB
Active Write - RMS Average1
W
1.91
2.14
3.06
4.45
4.74
5.24
5.59
Active Write - Burst2
W
2.04
2.43
3.36
5.42
7.08
8.34
8.44
Active Write - Max Burst3
W
3.72
3.52
4.49
6.80
8.02
8.80
9.90
Active Read - RMS Average
W
1.93
2.14
2.21
2.32
2.39
2.61
2.69
Active Read - Burst5
W
2.06
2.32
2.97
3.63
3.61
3.96
4.14
Active Read – Max Burst6
W
3.58
3.52
3.86
4.09
4.66
5.31
5.34
Idle
W
0.6
0.6
0.6
0.6
0.7
0.7
0.7
4
Notes:
1. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Average Power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
2. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Burst Power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
3. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is 0.25% of total time.
4. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) average power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
5. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
6. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is approximately 0.25% of
total time.
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Product Specification
11
Intel® Solid-State Drive DC S3510 Series
Table 9:
Power Consumption for 2.5-inch Form Factor (5V + 12V Supply)
Intel SSD DC S3510 Series
Specification1
Unit
800GB
5V
12V
120GB
5V
12V
240GB
5V
12V
480GB
5V
12V
800GB
5V
12V
1.2TB
5V
12V
1.6TB
5V
12V
Active Write - RMS
Average1
W
1.22 0.78 1.26 1.0
Active Write - Burst2
W
1.22 0.77 1.25 1.01 1.40 1.85 1.72 3.01 1.85 3.21 1.98 3.30 2.12 3.64
Active Write - Max Burst3
W
2.98 0.88 2.72 1.14 2.89 2.14 3.47 4.00 3.55 5.99 4.26 7.00 4.60 7.09
Active Read - RMS
Average4
W
1.43 0.56 1.49 0.72 1.55 0.75 1.64 0.77 1.69 0.76 1.88 0.81 1.90 0.88
Active Read - Burst5
W
1.42 0.56 1.50 0.71 1.54 0.76 1.62 0.77 1.73 0.95 1.89 0.82 1.88 0.87
Active Read – Max Burst6
W
3.13 0.70 2.79 0.91 2.79 1.34 3.23 1.40 3.45 1.68 3.97 1.71 4.40 1.84
Idle
W
0.60 0.01 0.60 0.01 0.60 0.01 0.60 0.01 0.60 0.01 0.70 0.01 0.70 0.01
1.40 1.87 1.71 2.95 1.76 3.11 1.99 3.24 2.13 3.63
Notes:
1. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Average Power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
2. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Burst Power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
3. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential writes. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is 0.25% of total time.
4. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) average power is
measured using Agilent Power Analyzer over a 100 ms sample period with PLI capacitor charge enabled.
5. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge disabled.
6. The workload equates 128 KB (131,072 bytes) Queue Depth equal to 32 sequential reads. RMS (Root Mean Squared) Max Burst power is
measured using Agilent Power Analyzer over a 500 µs sample period with PLI capacitor charge enabled. Pulse is approximately 0.25% of
total time.
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2.4
Environmental Conditions
Table 10:
Temperature, Shock, Vibration
Temperature
Range
Case Temperature
Operating
Non-operating1
0 – 70o C
-55 – 95o C
Temperature Gradient2
Operating
Non-operating
30o C/hr (Typical)
30o C/hr (Typical)
Humidity
Operating
Non-operating
5 – 95 %
5 – 95 %
Shock and Vibration
Range
Shock3
Operating
Non-operating
1,000 G (Max) at 0.5 ms
1,000 G (Max) at 0.5 ms
Vibration4
Operating
Non-operating
2.17 GRMS (5-700 Hz) Max
3.13 GRMS (5-800 Hz) Max
Notes:
1.
Contact your Intel representative for details on the non-operating temperature range.
2.
Temperature gradient measured without condensation.
3.
Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus may be applied
in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.
4.
Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus may be
applied in the X, Y or Z axis. Vibration specification is measured using RMS value.
2.5
Product Regulatory Compliance
Intel SSD DC S3510 Series meets or exceeds the regulatory or certification requirements listed in Table 11 below.
Table 11:
Product Regulatory Compliance Specifications
Title
Description
Region For Which
Conformity Declared
TITLE 47-Telecommunications CHAPTER 1—
FEDERAL COMMUNMICATIONS COMMISSION PART
15 — RADIO FREQUENCY DEVICES
ICES-003, Issue 4 Interference-Causing Equipment
Standard Digital Apparatus
FCC Part 15B Class B
USA
CA/CSA-CEI/IEC CISPR 22:02. This is CISPR
22:1997 with Canadian Modifications
Canada
IEC 55024 Information Technology Equipment —
Immunity characteristics— Limits and methods of
measurement CISPR24:2010
EN-55024: 1998 and its amendments
European Union
IEC 55022 Information Technology Equipment —
Radio disturbance Characteristics— Limits and
methods of measurement CISPR24:2008 (Modified)
EN-55022: 2006 and its amendments
European Union
EN-60950-1 2nd Edition
Information Technology Equipment —
Safety — Part 1: General Requirements
USA/Canada
UL/CSA EN-60950-1 2nd Edition
Information Technology Equipment —
Safety — Part 1: General Requirements
USA/Canada
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Intel® Solid-State Drive DC S3510 Series
2.6
Reliability
Intel SSD DC S3510 Series meets or exceeds SSD endurance and data retention requirements as specified in the
JESD218 standard. Reliability specifications are listed in Table 12 below:
Table 12:
Reliability Specifications
Parameter
Value
Uncorrectable Bit Error Rate (UBER)
Uncorrectable bit error rate will not exceed one sector in the specified number of bits read. In the unlikely event
of a non-recoverable read error, the SSD will report it as a
read failure to the host; the sector in error is considered corrupt and is not returned to the host.
< 1 sector per 1017 bits read
Mean Time Between Failures (MTBF)
Mean Time Between Failures is estimated based on
Telcordia* methodology and demonstrated through Reliability Demonstration Test (RDT).
2 million hours
Power On/Off Cycles
Power On/Off Cycles is defined as power being removed from the SSD, and then restored. Most host systems
remove power from the SSD when entering suspend and hibernate as well as on a system shutdown.
Insertion Cycles
SATA/power cable insertion/removal cycles.
Data Retention
The time period for retaining data in the NAND at
maximum rated endurance.
Endurance Rating
24 per day
50 on SATA cable
500 on backplane
3 months power-off retention once SSD
reaches rated write endurance at 40 °C
80GB: Up to 45TBW
120GB: Up to 70TBW
240GB: Up to 140TBE
While running JESD218 standard1 and based on JESD219
workload.
480GB: Up to 275TBW
800GB: Up to 450TBW
1.2TB: Up to 660TBW
1.6TB: Up to 880TBW
while running JESD218 standard1
Note:
1.
Refer to JESD218 standard table 1 for UBER, FFR and other Enterprise SSD endurance verification requirements. Endurance verification
acceptance criterion based on establishing <1E-16 at 60 confidence.
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2.7
Temperature Sensor
The Intel SSD DC S3510 Series has an internal temperature sensor with an accuracy of +/-2C over a range of -20C to
+80C which can be monitored using two SMART attributes: Airflow Temperature (BEh) and Device Internal
Temperature (C2h).For more information on supported SMART attributes, see “SMART Attributes” on page 18.
NOTE: The M.2 product will report the same value for both SMART attributes.
2.8
Power Loss Capacitor Test
The Intel SSD DC S3510 Series supports testing of the power loss capacitor, which can be monitored using the
following SMART attribute: (175, AFh).
2.9
Hot Plug Support
Hot Plug insertion and removal is supported in the presence of a proper connector and appropriate operating system
(OS), as described in the SATA 3.0 specification.
This product supports asynchronous signal recovery and issues an unsolicited COMINIT when first mated with a
powered connector to guarantee reliable detection by a host system without hardware device detection.
NOTE: Hot plug is not supported in the M.2 Specification. However, the M.2 can support hot plug operations when
used with an interposer design that electrically supports hot plug operations. User Data is protected from planned or
unplanned power loss by the Enhanced Power Management technology on the DC S3510 Series.
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15
Intel® Solid-State Drive DC S3510 Series
3
Mechanical Information
Figure 1 shows the physical package information for the Intel SSD DC S3510 Series in the 2.5 inch and M.2 form
factors. All dimensions are in millimeters.
Figure 1:
Intel SSD DC S3510 Series 2.5-inch Dimensions
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4
Pin and Signal Descriptions
4.1
2.5-inch Form Factor Pin Locations
Figure 2:
Layout of 2.5-inch Form Factor Signal and Power Segment Pins
Note: 2.5-inch connector supports built in latching capability.
4.2
Connector Pin Signal Definitions
Table 13:
Serial ATA Connector Pin Signal Definitions—2.5-inch and 1.8-inch Form Factors
Pin
Function
S1
Ground
S2
A+
S3
A-
S4
Ground
S5
B-
S6
B+
S7
Ground
Definition
1st mate
Differential signal pair A
1st mate
Differential signal pair B
1st mate
Note: Key and spacing separate signal and power segments.
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Intel® Solid-State Drive DC S3510 Series
4.3
Power Pin Signal Definitions
Table 14:
Serial ATA Power Pin Definitions—2.5-inch Form Factors
Pin1
Function
Definition
Mating Order
P12
Not connected
(3.3V Power)
--
P22
Not connected
(3.3V Power)
--
P32
Not connected
(3.3V Power; pre-charge)
2nd Mate
P43,4
Ground
Ground
1st Mate
P53
Ground
Ground
1st Mate
P63
Ground
Ground
1st Mate
P73,5
V5
5V Power
1st Mate
P83,5
V5
5V Power
2nd Mate
P93,5
V5
5V Power
2nd Mate
P103
Ground
Ground
1st Mate
P116
DAS
Device Activity Signal
2nd Mate
P123,4
Ground
Ground
1st Mate
P137
V12
12V Power
1st Mate
P147
V12
12V Power
2nd Mate
P157
V12
12V Power
2nd Mate
Notes:
1.
All pins are in a single row, with a 1.27 mm (0.050-inch) pitch.
2.
Pins P1, P2 and P3 are connected together, although they are not connected internally to the device. The host may put 3.3V on these pins.
3.
The mating sequence is:
• ground pins P4-P6, P10, P12 and the 5V power pin P7
• signal pins and the rest of the 5V power pins P8-P9
4.
Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to discharge ESD in a suitably configured backplane connector.
5.
Power pins P7, P8, and P9 are internally connected to one another within the device.
6.
The host may ground P11 if it is not used for Device Activity Signal (DAS).
7.
Pins P13, P14 and P15 are internally connected to one another within the device. The host may put 12V on these pins.
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Intel® Solid-State Drive DC S3510 Series
5
Supported Command Sets
The Intel SSD DC S3510 Series supports all mandatory ATA (Advanced Technology Attachment)
commands defined in the ATA8-ACS specification described in this section.
5.1
ATA General Feature Command Set
The Intel SSD DC S3510 Series supports the ATA General Feature command set (non- PACKET), which
consists of:
•
•
•
EXECUTE DEVICE DIAGNOSTIC
SET FEATURES
IDENTIFY DEVICE
Note: See Appendix A, “IDENTIFY DEVICE Command Data” for details on the sector data returned after
issuing an IDENTIFY DEVICE command.
The Intel SSD DC S3510 Series also supports the following optional commands:
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
READ DMA
WRITE DMA
READ SECTOR(S)
READ VERIFY SECTOR(S)
READ MULTIPLE
SEEK
SET FEATURES
WRITE SECTOR(S)
SET MULTIPLE MODE1
WRITE MULTIPLE
FLUSH CACHE
READ BUFFFER
WRITE BUFFER
NOP
DOWNLOAD MICROCODE
WRITE UNCORRECTABLE EXT
1. The only multiple supported will be multiple 1
5.2
Power Management Command Set
The Intel SSD DC S3510 Series supports the Power Management command set, which consists of:
•
•
•
•
•
•
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CHECK POWER MODE
IDLE
IDLE IMMEDIATE
SLEEP
STANDBY
STANDBY IMMEDIATE
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19
Intel® Solid-State Drive DC S3510 Series
5.3
Security Mode Feature Set
The Intel SSD DC S3510 Series supports the Security Mode command set, which consists of:
•
•
•
•
•
•
5.4
SECURITY
SECURITY
SECURITY
SECURITY
SECURITY
SECURITY
SET PASSWORD
UNLOCK
ERASE PREPARE
ERASE UNIT
FREEZE LOCK
DISABLE PASSWORD
SMART Command Set
The Intel SSD DC S3510 Series supports the SMART command set, which consists of:
•
•
•
•
•
•
•
•
•
•
•
5.4.1
SMART
SMART
SMART
SMART
SMART
SMART
SMART
SMART
SMART
SMART
SMART
READ DATA
READ ATTRIBUTE THRESHOLDS
ENABLE/DISABLE ATTRIBUTE AUTOSAVE
SAVE ATTRIBUTE VALUES
EXECUTE OFF-LINE IMMEDIATE
READ LOG SECTOR
WRITE LOG SECTOR
ENABLE OPERATIONS
DISABLE OPERATIONS
RETURN STATUS
ENABLE/DISABLE AUTOMATIC OFFLINE
Attributes
Table 15 lists the SMART attributes supported by the Intel SSD DC S3510 Series and the corresponding status flags
and threshold settings.
Table 15:
SMART Attributes
ID
Attribute
Status Flags
Threshold
SP
EC
ER
PE
OC
PW
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
Re-allocated Sector Count
05h
The raw value of this attribute shows the
number of retired blocks since leaving the factory
(grown defect count).
Power-On Hours Count
09h
The raw value reports power-on time, cumulative over
the life of the SSD, integer number in hour time units.
0Ch
Power Cycle Count
The raw value of this attribute reports the cumulative
number of power cycle events over the life of the device.
1
1
0
0
1
0
0 (none)
AAh
Available Reserved Space (See Attribute E8)
1
1
0
0
1
1
10
1
1
0
0
1
0
0 (none)
ABh
Program Fail Count
The raw value of this attribute shows total count of
program fails and the normalized value, beginning at
100, shows the percent remaining of allowable program fails.
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ID
Attribute
Status Flags
Threshold
SP
EC
ER
PE
OC
PW
ACh
Erase Fail Count
The raw value of this attribute shows total count of
erase fails and the normalized value, beginning at 100,
shows the percent remaining of allowable erase fails.
1
1
0
0
1
0
0 (none)
AEh
Unexpected Power Loss
Also known as “Power-off Retract Count” per magneticdrive terminology.
Reports number of unclean shutdowns, cumulative over
the life of the SSD.
An “unclean shutdown” is the removal of power without
STANDBY IMMEDIATE as the last command (regardless
of PLI activity using capacitor power).
1
1
0
0
1
0
0 (none)
1
1
0
0
1
1
10
Power Loss Protection Failure
Last test result as microseconds to discharge cap,
saturates at max value. Also logs minutes since last test
and lifetime number of tests.
Bytes 0-1: Last test result as microseconds to discharge
cap, saturates at max value. Test result expected in
range 25 <= result <= 5000000, lower indicates specific
error code
AFh
Bytes 2-3: Minutes since last test, saturates at max
value.
Bytes 4-5: Lifetime number of tests, not incremented on
power cycle, saturates at max value.
B7h
SATA Downshift Count
The count of the number of times SATA interface selected lower signaling rate due to error.
1
1
0
0
1
0
0 (none)
B8h
End-to-End Error Detection Count
Raw value: reports number of LBA tag mismatches in
end-to-end data protection path.
Normalized value: always 100.
1
1
0
0
1
1
90
BBh
Uncorrectable Error Count
The raw value shows the count of errors that could
not be recovered using Error
Correction Code (ECC).
Normalized value: always 100.
1
1
0
0
1
0
0 (none)
1
0
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
0
0
0
1
0
0 (none)
Temperature - Airflow Temperature (Case) Reports the
SSD case temperature.
BEh
Raw value suggests 100 - case temperature in C degrees.
Power-Off Retract Count (Unsafe Shutdown Count)
The raw value of this attribute reports the cumulative
number of unsafe (unclean) shutdown events over the
life of the device. An unsafe shutdown occurs whenever
the device is powered off without STANDBYIMMEDIATE
being the last command.
C0h
Temperature - Device Internal Temperature
C2h
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Reports internal temperature of the SSD. Temperature
reading is the value direct from the printed circuit board
(PCB) sensor without offset.
Product Specification
21
Intel® Solid-State Drive DC S3510 Series
ID
Attribute
Status Flags
Threshold
SP
EC
ER
PE
OC
PW
0
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
1
0
0
1
1
10
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
Pending Sector Count
C5h
Number of current unrecoverable read errors that will
be re-allocated on next write.
CRC Error Count
C7h
The total number of encountered SATA interface cyclic
redundancy check (CRC) errors.
Host Writes
E1h
The raw value of this attribute reports the total number
of sectors written by the host system. The raw value is
increased by 1 for every 65,536 sectors (32MB) written
by the host.
Timed Workload Media Wear
E2h
Measures the wear seen by the SSD (since reset of the
workload timer, attribute E4h), as a percentage of the
maximum rated cycles.
Timed Workload Host Read/Write Ratio
E3h
Shows the percentage of I/O operations that are read
operations (since reset of the workload timer, attribute
E4h).
Timed Workload Timer
E4h
Measures the elapsed time (number of minutes since
starting this workload timer).
Available Reserved Space
E8h
This attribute reports the number of reserve blocks
remaining. The normalized value begins at 100 (64h),
which corresponds to 100 percent availability of the
reserved space. The threshold value for this attribute is
10 percent availability.
Media Wearout Indicator
E9h
This attribute reports the number of cycles the NAND
media has undergone. The normalized value declines
linearly from 100 to 1 as the average erase cycle count
increases from 0 to the maximum rated cycles.
Once the normalized value reaches 1, the number will not
decrease, although it is likely that significant additional
wear can be put on the device.
Thermal Throttle Status
Reports Percent Throttle Status and Count of events
EAh
Byte 0 = Throttling status. Decimal value 0 = No Throttle Applied, 100 = 100% throttling applied. Intermediate percentages are supported. A value larger than 100d
is invalid.
Bytes 1-4 = Throttling event count. 32 bit counter indicates the number of times thermal throttle has activated.
Value is preserved over power cycles.
Byte 5 = Reserved
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ID
Status Flags
Attribute
Threshold
SP
EC
ER
PE
OC
PW
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
1
1
0
0
1
0
0 (none)
Total LBAs Written
The raw value of this attribute reports the total number
of sectors written by the host system. The raw value is
increased by 1 for every 65,536 sectors (32MB) written
by the host.
F1h
Total LBAs Read
The raw value of this attribute reports the total number
of sectors read by the host system. The raw value is
increased by 1 for every 65,536 sectors (32MB) read by
the host.
F2h
Total Bytes Written
The raw value of this attribute reports the total number
of sectors written to the NAND media. This includes
NAND writes triggered by host writes, defrag,
background data refresh and wear level relocation writes
etc. The raw value is increased by 1 for every 65,536
F3h
sectors (32MB) writes to the NAND media. Upon NAND
write, new value returned once per minute.
Table 16:
SMART Attribute Status Flags
Status Flag
SP
5.4.2
Description
Self-preserving attribute
Value = 0
Not a self-preserving attribute
Value = 1
Self-preserving attribute
EC
Event count attribute
Not an event count attribute
Event count attribute
ER
Error rate attribute
Not an error rate attribute
Error rate attribute
PE
Performance attribute
Not a performance attribute
Performance attribute
OC
Online collection attribute
Collected only during offline
activity
Collected during both offline and
online activity
PW
Pre-fail warranty attribute
Advisory
Pre-fail
Timed Workload Endurance Indicators
Timed Workload Media Wear Indicator — ID E2h
This attribute tracks the drive wear seen by the device during the last wear timer loop, as a
percentage of the maximum rated cycles. The raw value tracks the percentage up to 2 decimal
precision points. This value should be divided by 1024 to get the percentage.
For example: if the raw value is 4455, the percentage is 4455/1024 = 4.35%. The raw value is held
at FFFFh until the wear timer (attribute E4h) reaches 60 (minutes) after a SMART EXECUTE OFFLINE
IMMEDIATE (B0h/D4h) subcommand 40h to the SSD. The normalized value is always set to 100 and
should be ignored.
Timed Workload Host Reads Percentage — ID E3h
This attribute shows the percentage of I/O operations that are read operations during the last
workload timer loop. The raw value tracks this percentage and is held at FFFFh until the workload
timer (attribute E4h) reaches 60 (minutes). The normalized value is always set to 100 and should be
ignored.
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Intel® Solid-State Drive DC S3510 Series
Workload Timer — ID E4h
This attribute is used to measure the time elapsed during the current workload. The attribute is reset when a SMART EXECUTE OFFLINE IMMEDIATE (D4h) subcommand 40h is issued to the drive.
The raw value tracks the time in minutes and has a maximum value of 232 = 4,294,967,296 minutes
(8,171 years). The normalized value is always set to 100 and should be ignored.
User Notes
•
Sending a SMART EXECUTE OFFLINE IMMEDIATE (B0h/D4h) subcommand 40h to the SSD
resets and starts all three attributes (Media Wear Indicator, Attribute E2h, Host Reads
Percentage, Attribute E3h, and the Workload timer, Attribute E4h to FFFFh.
•
The Attribute raw values are held at FFFFh until the Workload timer (Attribute E4h) reaches
a total of 60 (minutes) of power on time. After 60 minutes, the Timed Workload data is
made available.
•
After the Workload timer (E4h) reaches 60 (minutes), the Timed Workload data is saved
every minute so only 59 seconds of data is lost if power is removed without receiving ATA
STANDBY IMMEDIATE. Accumulated data is not reset due to power loss.
•
Upon power up, the attributes hold a snapshot of their last saved values for 59 seconds
and live data is available after 60 seconds, once the initial one hour interval is completed.
Example Use Cases
The Timed Workload Endurance attributes described in this section are intended to be used to
measure the amount of media wear that the drive is subjected to during a timed workload.
Ideally, the system that the drive is being used in should be capable of issuing SMART commands.
Otherwise, provisions have been provided to allow the media wear attributes to be persistent so the
drive can be moved to a SMART capable system to read out the drive wear attribute values.
Use Case 1 – With a System Capable of SMART Commands
1.
On a SMART capable system, issue the SMART EXECUTE OFF-LINE IMMEDIATE (D4h) subcommand 40h to reset the drive wear attributes.
2.
Run the workload to be evaluated for at least 60 minutes. Otherwise the drive wear attributes will not be available.
3.
Read out the drive wear attributes with the SMART READ DATA (D0h) command.
Use Case 2 – With a System Not Capable of SMART Commands
Product Specification
24
1.
On a SMART capable system, issue the SMART EXECUTE OFF-LINE IMMEDIATE (D4h) subcommand 40h to reset the drive wear attributes.
2.
Move the drive to the system where the workload will be measured (and not capable of
SMART commands).
3.
Run the workload to be evaluated for at least 60 minutes. Otherwise the drive wear attributes will not be available.
4.
Do a clean system power down by issuing the ATA STANDBY IMMEDIATE command prior
to shutting down the system. This will store all the drive wear SMART attributes to persistent memory within the drive.
5.
Move the drive to a SMART capable system.
6.
Read out the drive wear attributes with the SMART READ DATA (D0h) command within 59
seconds after power-up.
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Example Calculation of Drive Wear
The following is an example of how the drive wear attributes can be used to evaluate the impact of a
given workload. The Host Writes SMART attribute (E1h) can also be used to calculate the amount of
data written by the host during the workload by reading this attribute before and after running the
workload. This example assumes that the steps shown in “Example Use Cases” on page 18 were followed to obtain the following attribute values:
•
Timed Workload Media Wear (E2h) has a raw value of 16. Therefore, the percentage wear =
16/1024 = 0.016%.
•
Timed Workload Host Read/Write Ratio (E3h) has a normalized value of 80, indicating that
80% of operations were reads.
•
Workload Timer (E4h) has a raw value of 500. Therefore the workload ran for 500 minutes.
•
Host Writes Count (E1h) had a raw value of 100,000 prior to running the workload and a
value of 130,000 at the end of the workload. Therefore, the number of sectors written by
the host during the workload was 30,000 * 65,535 = 1,966,050,000 sectors or
1,966,050,000 * 512/1,000,000,000 = 1,007 GB.
The following conclusions can be made for this example case:
The workload took 500 minutes to complete with 80% reads and 20% writes. A total of 1,007 GB of
data was written to the device, which increased the media wear in the drive by 0.016%. At this point
in time, this workload is causing a wear rate of 0.016% for every 500 minutes, or 0.00192%/hour.
5.4.3
SMART Logs
The Intel SSD DC S3510 Series implements the following Log Addresses: 00h, 02h, 03h, 06h, and 07h.
The DC S3510 Series implements host vendor specific logs (addresses 80h-9Fh) as read and write
scratchpads, where the default value is zero (0). Intel SSD DC S3510 does not write any specific values to
these logs unless directed by the host through the appropriate commands.
The DC S3510 Series also implements a device vendor specific log at address A9h as a read-only log
area with a default value of zero (0). Besides that, the DC S3510 Series also implements log address B8h
(if the drive is in disable logical mode, log address B8h will have the word error code for *BAD_CTX).
Finally the DC S3510 Series also implements log at addresses B9h and BAh (both of them are Intel error
logs, and read only for customers).
5.5
Device Statistics
In addition to the SMART attribute structure, statistics pertaining to the operation and health of the Intel
SSD DC S3510 Series can be reported to the host on request through the Device Statistics log as defined
in the ATA specification.
The Device Statistics log is a read-only GPL/SMART log located at read log address 0x04 and is
accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG commands.
Table 17 lists the Device Statistics supported by the Intel SSD DC S3510 Series.
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Intel® Solid-State Drive DC S3510 Series
Table 17:
Serial ATA Power Pin Definitions—2.5-inch Form Factors
Page
0x00
0x01 – General Statistics
0x04 – General Error Statistics
0x05 – Temperature Statistics
0x06 – Transport Statistics
Offset
--
Description
List of Supported Pages
Equivalent SMART
attribute (if applicable)
--
0x08
Power Cycle Count
0Ch
0x10
Power-On Hours
09h
0x18
Logical Sectors Written
E1h
0x20
Num Write Commands – incremented by
one for every host write
0x28
Logical Sectors Read
0x30
Num Read Commands – incremented by one
for every host read
0x08
Num Reported Uncorrectable Errors
0x10
Num Resets Between Command Acceptance
and Completion
--
0x00
Device Statistics Information Header
--
0x08
Current Temperature
--
0x10
Average Short Term Temperature
--
0x18
Average Long Term Temperature
--
0x20
Highest Temperature
--
0x28
Lowest Temperature
--
0x30
Highest Average Short Term Temperature
--
0x38
Lowest Average Short Term Temperature
--
0x40
Highest Average Long Term Temperature
--
0x48
Lowest Average Long Term Temperature
--
0x50
Time in Over-Temperature
--
0x58
Specified Maximum Operating Temperature
--
0x60
Time in Under-Temperature
--
0x68
Specified Minimum Operating Temperature
--
0x08
Number of Hardware Resets
--
0x10
Number of ASR Events
--
0x18
Number of Interface CRC Errors
--
-F2h
-BBh
E9h
0x07 – Solid State Device
Statistics
Product Specification
26
0x08
Percentage Used Endurance Indicator
Note: This device
statistic counts from 1 to
150
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Intel® Solid-State Drive DC S3510 Series
5.6
SMART Command Transport (SCT)
With SMART Command Transport (SCT), a host can send commands and data to an SSD and receive
status and data from an SSD using standard write/read commands to manipulate two SMART Logs:
•
Log Address E0h ("SCT Command/Status") — used to send commands and retrieve status
•
Log Address E1h ("SCT Data Transfer") — used to transport data
Intel SSD DC S3510 supports the following standard SCT actions:
5.7
•
Write Same — DC S3510 Series implements this action code as described in the ATA
specification.
•
Error Recovery Control — DC S3510 Series accepts this action code, and will store and return
error-recovery time limit values.
•
Feature Control - DC S3510 Series supports feature code 0001h (write cache) feature code
0002h (write cache reordering), and feature code 0003h (time interval for temperature logging).
It also supports D000h (Power Safe Write Cache capacitor test interval), D001h (read/write
power governor mode), D002h (read thermal governor mode), D003h (read power governor
burst power), and D004h (read power governor average power).
•
Data table command - DC S3510 Series supports data table command as specified in ATA8ACS2. This will read out temperature logging information in table ID 0002h.
•
Read Status Support - DC S3510 supports read status log
•
By using SCT command 0xD801with State=0, Option=1, ID Word 106 can be changed from
0x6003 to 0x4000 (4KB physical sector size to 512B physical sector size support change).
Data Set Management Command Set
Intel SSD DC S3510 Series supports the Data Set Management command set Trim attribute, which consists of:
•
5.8
DATA SET MANAGEMENT
Host Protected Area Command Set
Intel SSD DC S3510 Series supports the Host Protected Area command set, which consists of:
•
•
•
•
READ NATIVE MAX ADDRESS
SET MAX ADDRESS
READ NATIVE MAX ADDRESS EXT
SET MAX ADDRESS EXT
Intel SSD DC S3510 Series also supports the following optional commands:
•
•
•
•
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SET
SET
SET
SET
MAX
MAX
MAX
MAX
SET PASSWORD
LOCK
FREEZE LOCK
UNLOCK
Product Specification
27
Intel® Solid-State Drive DC S3510 Series
5.9
48-Bit Address Command Set
Intel SSD DC S3510 Series supports the 48-bit Address command set, which consists of:
•
•
•
•
•
•
•
•
•
•
•
5.10
FLUSH CACHE EXT
READ DMA EXT
READ NATIVE MAX ADDRESS EXT
READ SECTOR(S) EXT
READ VERIFY SECTOR(S) EXT
SET MAX ADDRESS EXT
WRITE DMA EXT
WRITE MULTIPLE EXT
WRITE SECTOR(S) EXT
WRITE MULTIPLE FUA EXT
WRITE DMA FUA EXT
General Purpose Log Command Set
Intel SSD DC S3510 Series supports the General Purpose Log command set, which consists of:
•
•
5.11
READ LOG EXT
WRITE LOG EXT
Native Command Queuing
Intel SSD DC S3510 Series supports the Native Command Queuing (NCQ) command set, which includes:
•
•
Note:
5.12
READ FPDMA QUEUED
WRITE FPDMA QUEUED
With a maximum Queue Depth set to 32.
Software Settings Preservation
Intel SSD DC S3510 Series supports the SET FEATURES parameter to enable/disable the preservation of
software settings.
Product Specification
28
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Intel® Solid-State Drive DC S3510 Series
6
Certifications and Declarations
The following table describes the Device Certifications supported by the Intel SSD DC S3510 Series.
Table 18:
Device Certifications and Declarations
Certification
CE Compliant
UL Recognized
Description
Low Voltage DIRECTIVE 2006/95/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of
12 December 2006, and EMC Directive 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF
THE COUNCIL of 15 December 2004.
Underwriters Laboratories, Inc. Bi-National Component Recognition; UL 60950-1, 2nd Edition,
2007-03-27 (Information Technology Equipment - Safety - Part 1: General Requirements)
CSA C22.2 No. 60950-1-07, 2nd Edition, 2007-03 (Information Technology Equipment - Safety Part 1: General Requirements)
C-Tick Compliant
Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).
BSMI Compliant
Compliance to the Taiwan EMC standard CNS 13438: Information technology equipment - Radio
disturbance Characteristics - limits and methods of measurement, as amended on June 1, 2006,
is harmonized with CISPR 22: 2005.04.
KCC
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control
Regulation and meets the Electromagnetic Compatibility (EMC) Framework requirements of the
Radio Research Laboratory (RRL) Ministry of Information and Communication Republic of Korea.
VCCI
Voluntary Control Council for Interface to cope with disturbance problems caused by personal
computers or facsimile.
RoHS Compliant
Restriction of Hazardous Substance Directive
WEEE
Directive on Waste Electrical and Electronic Equipment
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Product Specification
29
Intel® Solid-State Drive DC S3510 Series
7
References
The following table identifies the standards information referenced in this document.
Table 19:
Standards References
Date
Title
Location
July 2012
Solid-State Drive (SSD) Requirements and Endurance Test
Method (JESD219)
http://www.jedec.org/standardsdocuments/results/jesd219
Sept 2010
Solid-State Drive (SSD) Requirements and Endurance Test
Method (JESD218)
http://www.jedec.org/standardsdocuments/docs/jesd218/
Dec 2008
VCCI
http://www.vcci.jp/vcci_e/
http://qdms.intel.com/
Click Search MDDS Database and
search for material description
datasheet
June 2009
RoHS
August 2009
ACS-2-ATA/ATAPI Command Set 2 Specification
http://www.t13.org/
June 2009
Serial ATA Revision 3.0
http://www.sata-io.org/
May 2006
SFF-8223, 2.5-inch Drive w/Serial Attachment Connector
http://www.sffcommittee.org/
May 2005
SFF-8201, 2.5-inch drive form factor
http://www.sffcommittee.org/
International Electrotechnical Commission EN 61000
1995
1996
1995
1995
1997
1994
1995
4-2 (Electrostatic discharge immunity test)
4-3 (Radiated, radio-frequency, electromagnetic field immunity test)
4-4 (Electrical fast transient/burst immunity test)
4-5 (Surge immunity test)
http://www.iec.ch/
4-6 (Immunity to conducted disturbances, induced by radiofrequency fields)
4-11 (Voltage Variations, voltage dips, short interruptions and
voltage variations immunity tests)
ENV 50204
http://www.dbicorporation.com/
(Radiated electromagnetic field from digital radio telephones)
radimmun.htm/
Product Specification
30
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Intel® Solid-State Drive DC S3510 Series
Appendix A: IDENTIFY DEVICE Command Data
Table 20:
Returned Sector Data
Word
F = Fixed
V = Variable
X = Both
Default Value
Description
0
X
0040h
General configuration bit-significant information
1
X
3FFFh
Obsolete - Number of logical cylinders (16,383)
2
V
C837h
Specific configuration
Obsolete - Number of logical heads (16)
3
X
0010h
4-5
X
0h
6
X
003Fh
7-8
V
0h
Reserved for assignment by the CompactFlash* Association (CFA)
9
X
0h
Retired
10-19
F
varies
20-21
X
0h
Retired
22
X
0h
Obsolete
23-26
F
varies
Firmware revision (8 ASCII characters)
27-46
F
varies
Model number (Intel® Solid-State Drive)
47
F
8001h
7:0—Maximum number of sectors transferred per interrupt on
multiple commands
Retired
Obsolete - Number of logical sectors per logical track (63)
Serial number (20 ASCII characters)
48
F
4000h
Trusted Computing Feature Set
49
F
2F00h
Capabilities
50
F
4000h
Capabilities
51-52
X
0h
53
F
0007h
Words 88 and 70:64 valid
54
X
3FFFh
Obsolete - Number of logical cylinders (16,383)
55
X
0010h
Obsolete - Number of logical heads (16)
56
X
003Fh
Obsolete - Number of logical sectors per logical track (63)
57-58
X
FC1000FBh
59
F
BF01
60-61
V
80GB: 0950F8B0h
120GB: 0DF94B80h
200GB: 0FFFFFFFh
400GB: 0FFFFFFFh
480GB: 0FFFFFFFh
800GB: 0FFFFFFFh
1200GB: 0FFFFFFFh
1600GB: 0FFFFFFFh
62
X
0h
63
X
0007h
Multi-word DMA modes supported/selected
64
F
0003h
PIO modes supported
65
F
0078h
Minimum multiword DMA transfer cycle time per word
66
F
0078h
Manufacturer’s recommended multiword DMA transfer cycle time
67
F
0078h
Minimum PIO transfer cycle time without flow control
68
F
0078h
Minimum PIO transfer cycle time with IORDY flow control
69
F
4030h
Additional Supported
70
F
0000h
Reserved
71-74
F
0h
75
F
001Fh
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Obsolete
Obsolete
Number of sectors transferred per interrupt on multiple commands
Total number of user-addressable sector for 28-bit commands
Obsolete
Reserved for IDENTIFY PACKET DEVICE command
Queue depth
Product Specification
31
Intel® Solid-State Drive DC S3510 Series
Word
F = Fixed
V = Variable
X = Both
Default Value
Description
76
F
850Eh
Serial ATA capabilities
77
F
0006h
Reserved for future Serial ATA definition
78
F
0040h
Serial ATA features supported
79
V
0040h
Serial ATA features enabled
80
F
03FCh
Major version number
81
F
0110h
Minor version number
82
F
746Bh
Command set supported
83
F
7501h
Command sets supported
84
F
6163h
Command set/feature supported extension
85
X
7469h
Command set/feature enabled
86
X
B401h
Command set/feature enabled
87
X
6163h
Command set/feature default
88
X
407Fh
Ultra DMA Modes
89
F
0002h
Time required for security erase unit completion
90
F
0002h
Time required for enhanced security erase completion
91
V
0h
92
V
0FFFEh
93
X
0h
Hardware reset result: the contents of bits (12:0) of this word shall
change only during the execution of a hardware reset
94
V
0h
Vendor’s recommended and actual acoustic management value
95
F
0h
Stream minimum request size
96
V
0h
Streaming transfer time - DMA
97
V
0h
Streaming access latency - DMA and PIO
98-99
F
0h
Streaming performance granularity
100-103
V
80GB: 0950F8B0h
120GB: 0DF94BB0h
200GB: 1749F1B0h
400GB: 2E9390B0h
480GB: 37E436B0h
800GB: 5D26CEB0h
1200GB: 8BBA0CB0h
1600GB: BA4D4AB0h
104
V
0h
105
V
0006h
106
F
6003h
Current advanced power management value
Master Password Revision Code
Maximum user LBA for 48-bit address feature set
Streaming transfer time - PIO
Maximum number of 512-byte blocks of LBA Range Entries per DATA
SET MANAGEMENT command
Physical sector size / logical sector size – User Changeable by SCT
command to report 512B
107
F
0h
108-111
F
varies
112-115
F
0h
Reserved for worldwide name extension to 128 bits
Reserved for technical report
Words per logical sector
Inter-seek delay for ISO-7779 acoustic testing in microseconds
Unique ID
116
V
0h
117-118
F
0h
119
F
405Ch
Supported settings
120
X
401Ch
Command set/feature enabled/supported
121-126
F
0h
Reserved
127
X
0h
Removable Media Status Notification feature set support
128
X
0021h
Security status
129
V
001Ch
Vendor-specific
Product Specification
32
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Intel® Solid-State Drive DC S3510 Series
Word
F = Fixed
V = Variable
X = Both
Default Value
Description
130-139
X
0h
Vendor-specific
140-149
X
0h
Disable Logical Error Field
150-159
X
0h
Vendor-specific
160
X
0h
CompactFlash Association (CFA) power mode 1
161-167
X
0h
Reserved for assignment by the CFA
168
X
0003h
Reserved for assignment by the CFA
169
X
0001h
Data set management Trim attribute support
170-175
F
0h
176-205
V
Varies
Current media serial number
206
X
003Dh
SCT Command Transport
207-208
F
0000h
Reserved
209
X
4000h
Alignment of logical blocks within a physical block
210-211
V
0000h
Write-Read-Verify Sector Count Mode 3 (DWord)
212-213
F
0000h
Write-Read-Verify Sector Count Mode 2 (DWord)
214
X
0000h
NV Cache Capabilities
215-216
V
0000h
NV Cache Size in Logical Blocks (DWord)
217
F
0001h
Nominal media rotation rate
218
V
0000h
Reserved
219
F
0000h
NV Cache Options
220
V
0000h
Write-Read-Verify feature set
Reserved for assignment by the CFA
221
X
0000h
Reserved
222
F
101Fh
Transport major version number
223
F
0000h
Transport minor version number
224-229
F
0000h
Reserved
230-233
X
0000h
Extended Number of User Addressable Sectors (QWord)
234
F
0001h
Minimum number of 512-byte data blocks per DOWNLOAD
MICROCODE command for mode 03h
235
F
FFFFh
Maximum number of 512-byte data blocks per DOWNLOAD
MICROCODE command for mode 03h
236-254
X
0000h
Reserved
255
V
Varies
Integrity word
Notes:
F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change when media is removed or
changed.
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or the commands executed by the
device.
X = F or V. The content of the word may be fixed or variable.
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Product Specification
33