Texas Instruments | ADS5444-EP | Datasheet | Texas Instruments ADS5444-EP Datasheet

Texas Instruments ADS5444-EP Datasheet
ADS5444-EP
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SGLS360 – AUGUST 2006
13-BIT 250-MSPS ANALOG-TO-DIGITAL CONVERTER
FEATURES
•
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•
•
•
•
•
•
•
•
•
•
•
•
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Controlled Baseline
– One Assembly
– One Test Site
– One Fabrication Site
Extended Temperature Performance of –55°C
to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree(1)
13-Bit Resolution
250-MSPS Sample Rate
SNR = 69 dBc at 100-MHz IF and 250 MSPS
SFDR = 76 dBc at 100-MHz IF and 250 MSPS
SNR = 67.7 dBc at 230-MHz IF and 250 MSPS
SFDR = 77 dBc at 230-MHz IF and 250 MSPS
2.2-VPP Differential Input Voltage
Fully Buffered Analog Inputs
5-V Analog Supply Voltage
LVDS Compatible Outputs
Total Power Dissipation: 2 W
Offset Binary Output Format
•
•
•
TQFP-80 PowerPAD™ Package
Pin Compatible With the ADS5440
Military Temperature Range = –55°C to 125°C
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
APPLICATIONS
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Test and Measurement
Software-Defined Radio
Multichannel Base Station Receivers
Base Station Tx Digital Predistortion
Communications Instrumentation
RELATED PRODUCTS
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•
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ADS5424 - 14-Bit, 105 MSPS ADC
ADS5423 - 14-Bit, 80 MSPS ADC
ADS5440 - 13-Bit, 210 MSPS ADC
DESCRIPTION
The ADS5444 is a 13-bit 250-MSPS analog-to-digital converter (ADC) that operates from a 5-V supply, while
providing LVDS-compatible digital outputs from a 3.3-V supply. The ADS5444 input buffer isolates the internal
switching of the onboard track and hold (T&H) from disturbing the signal source. An internal reference generator
is also provided to further simplify the system design. The ADS5444 has outstanding low noise and linearity over
input frequency.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated
ADS5444-EP
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SGLS360 – AUGUST 2006
AVDD
AIN
AIN
A1
TH1
+
TH2
Σ
A2
+
TH3
ADC1
Reference
A3
ADC3
−
−
VREF
Σ
DVDD
DAC1
ADC2
5
DAC2
5
5
Digital Error Correction
CLK
CLK
Timing
OVR
OVR
DRY
DRY
D[12:0]
GND
B0061-01
The ADS5444 is available in an 80-pin TQFP PowerPAD™ package. The ADS5444 is built on a state-of-the-art
Texas Instruments complementary bipolar process (BiCom3X) and is specified over the full military temperature
range (–55°C to 125°C).
2
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGING/ORDERING INFORMATION (1)
Product
ADS5444
(1)
(2)
PackageLead
Package
Designator
HTQFP-80 (2)
PowerPAD
(1)
PFP
Specified
Temperature
Range
Package
Marking
Ordering
Number
Transport
Media,
Quantity
–55°C to 125°C
ADS5444M-EP
ADS5444MPFPEP
Tray, 96
For the most current product and ordering information, see the Package Option Addendum located at the end of this document, or see
the TI website at www.ti.com.
Thermal pad size: 7,5 mm x 7,5 mm (typ)
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
VALUE / UNIT
Supply voltage
AVDD to GND
6V
DRVDD to GND
5V
Analog input to GND
–0.3 V to AVDD + 0.3 V
Clock input to GND
–0.3 V to AVDD + 0.3 V
±2.5 V
CLK to CLK
Digital data output to GND
–0.3 V to DRVDD + 0.3 V
Operating temperature range
–55°C to 125°C
Maximum junction temperature
150°C
Storage temperature range
–65°C to 150°C
ESD Human Body Model (HBM)
(1)
2.5 kV
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond
those specified is not implied.
THERMAL CHARACTERISTICS (1)
PARAMETER
θJA
θJC
(1)
TYP
UNIT
Soldered slug, no airflow
TEST CONDITIONS
21.7
°C/W
Soldered slug, 250-LFPM airflow
15.4
°C/W
50
°C/W
Unsoldered slug, 250-LFPM airflow
43.4
°C/W
Bottom of package (heatslug)
2.99
°C/W
Unsoldered slug, no airflow
Using 36 thermal vias (6 x 6 array). See the Application Section.
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Years Estimated LIfe
1000
100
Wirebond Voiding Fail Mode
10
Electromigration Fail Mode
1
0.1
120
130
140
150
160
Continuous TJ − 5C
Figure 1. ADS5444MPFPEP Operating Life Derating Chart
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170
180
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RECOMMENDED OPERATING CONDITIONS
MIN
NOM
MAX
UNIT
4.75
5
5.25
V
3
3.3
3.6
V
SUPPLIES
AVDD
Analog supply voltage
DRVDD
Output driver supply voltage
ANALOG INPUT
VCM
Differential input range
2.2
VPP
Input common mode
2.4
V
CLOCK INPUT
1/tC
ADCLK input sample rate (sine wave)
10
250
Clock amplitude, differential sine wave
Clock duty cycle
TA
MSPS
3
VPP
50%
Open free-air temperature
–55
°C
125
ELECTRICAL CHARACTERISTICS
Min, Typ, and Max values at TA = 25°C, full temperature range is TMIN = –55°C to TMAX = 125°C, sampling rate = 250 MSPS,
50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, –1-dBFS differential input, and 3-VPP differential clock (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
Resolution
TYP
MAX
UNIT
13
Bits
2.2
Vpp
1
kΩ
ANALOG INPUTS
Differential input range
Differential input resistance (DC)
Differential input capacitance
1.5
pF
Analog input bandwidth
800
MHz
2.4
V
INTERNAL REFERENCE VOLTAGE
VREF
Reference voltage
DYNAMIC ACCURACY
No missing codes
DNL
INL
Differential linearity error
Integral linearity error
Assured
fIN = 10 MHz
fIN = 10 MHz
TA = 25°C
–1
±0.4
1
Full temp range
–1
±0.4
2
TA = 25°C
–2.2
±0.9
2.2
Full temp range
–4.3
±2.7
4.3
Offset error
–11
Offset temperature coefficient
Gain error
–5
Gain temperature coefficient
PSRR
11
0.0005
fIN = 100 MHz
LSB
LSB
mV
mV/°C
5
%FS
–0.02
∆%/°C
1
mV/V
POWER SUPPLY
IAVDD
Analog supply current
IDRVDD
Output buffer supply current
340
VIN = full scale, fIN = 100 MHz, FS = 250
MSPS
Power dissipation
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430
mA
80
100
mA
2
2.37
W
5
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ELECTRICAL CHARACTERISTICS (continued)
Min, Typ, and Max values at TA = 25°C, full temperature range is TMIN = –55°C to TMAX = 125°C, sampling rate = 250 MSPS,
50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, –1-dBFS differential input, and 3-VPP differential clock (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DYNAMIC AC CHARACTERISTICS
fIN = 10 MHz
69.3
fIN = 70 MHz
69
fIN = 100 MHz
SNR
Signal-to-noise ratio
TA = 25°C
Full temp range
67
64.25
68.3
fIN = 230 MHz
67.7
fIN = 300 MHz
67
fIN = 400 MHz
66
fIN = 10 MHz
85
fIN = 100 MHz
HD2
HD3
Spurious free dynamic range
Second harmonic
Third harmonic
Worst other harmonic/spur (other than
HD2 and HD3)
6
69
fIN = 170 MHz
fIN = 70 MHz
SFDR
69
dBc
77
TA = 25°C
70
77
Full temp range
64
77
fIN = 170 MHz
74
fIN = 230 MHz
77
fIN = 300 MHz
70
fIN = 400 MHz
64
fIN = 10 MHz
87
fIN = 70 MHz
77
fIN = 100 MHz
80
fIN = 170 MHz
74
fIN = 230 MHz
78
fIN = 300 MHz
70
fIN = 400 MHz
64
fIN = 10 MHz
86
fIN = 70 MHz
82
fIN = 100 MHz
79
fIN = 170 MHz
80
fIN = 230 MHz
91
fIN = 300 MHz
80
fIN = 400 MHz
69
fIN = 10 MHz
90
fIN = 70 MHz
95
fIN = 100 MHz
82
fIN = 170 MHz
80
fIN = 230 MHz
83
fIN = 300 MHz
86
fIN = 400 MHz
85
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dBc
dBc
dBc
dBc
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ELECTRICAL CHARACTERISTICS (continued)
Min, Typ, and Max values at TA = 25°C, full temperature range is TMIN = –55°C to TMAX = 125°C, sampling rate = 250 MSPS,
50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, –1-dBFS differential input, and 3-VPP differential clock (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
fIN = 10 MHz
67.6
fIN = 170 MHz
66.5
fIN = 230 MHz
67
fIN = 300 MHz
65
Effective number of bits
fIN = 10 MHz
RMS idle channel noise
Inputs tied to common-mode
UNIT
68
fIN = 100 MHz
fIN = 400 MHz
ENOB
MAX
69
fIN = 70 MHz
SINAD
TYP
dBc
61
11.2
Bits
0.4
LSB
DIGITAL CHARACTERISTICS – LVDS DIGITAL OUTPUTS
Differential output voltage
0.247
Output offset voltage
1.125
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1.25
0.452
V
1.375
V
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TIMING CHARACTERISTICS
tA
N+3
N
AIN
N+1
N+2
tCLK
CLK, CLK
tCLKH
N+1
N
N+4
tCLKL
N+2
N+3
N+4
tC_DR
D[12:0],
OVR, OVR
N−3
tr
N−2
tf
tsu_c
N−1
th_c
N
th_DR
tsu_DR
DRY, DRY
tDR
T0073-01
Figure 2. Timing Diagram
TIMING CHARACTERISTICS
Min, Typ, Max over full temperature range, 50% clock duty cycle, sampling rate = 250 MSPS, AVDD = 5 V, DRVDD = 3.3 V
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tA
Aperture delay
500
ps
tJ
Clock slope independent aperture uncertainty (jitter)
200
fs RMS
Latency
4
cycles
tCLK
Clock period
4
ns
tCLKH
Clock pulse width high
2
ns
tCLKL
Clock pulse width low
2
ns
Clock Input
Clock to DataReady (DRY)
tDR
Clock rising to DataReady falling
tC_DR
Clock rising to DataReady rising
1.1
Clock duty cycle = 50%
(1)
2.7
3.1
ns
3.5
ns
Clock to DATA, OVR (2)
tr
Data rise time (20% to 80%)
0.6
ns
tf
Data fall time(80% to 20%)
0.6
ns
tsu_c
Data valid to clock (setup time)
3.1
ns
th_c
Clock to invalid Data (hold time)
0.2
ns
DataReady (DRY)/DATA, OVR (2)
tsu(DR)
Data valid to DRY
1.7
2
ns
th(DR)
DRY to invalid Data
0.9
1.3
ns
(1)
(2)
8
tC_DR = tDR + tCLKH for clock duty cycles other than 50%
Data is updated with clock falling edge or DRY rising edge.
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D5
D5
D6
D6
GND
DVDD
D7
D7
D8
D8
D9
D9
D10
D10
D11
D11
D12
D12
DRY
DRY
21
7 8 9 10 11 12 13 14 15 16 17 18 19 20
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41
40
6
39
4 5
61
1 2 3
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
GND
GND
AVDD
GND
AVDD
GND
AVDD
GND
NC
GND
AVDD
GND
NC
GND
AVDD
GND
AVDD
GND
AVDD
GND
AVDD
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D4
D4
D3
D3
D2
D2
D1
D1
GND
DVDD
D0
D0
NC
NC
NC
NC
NC
NC
OVR
OVR
DVDD
GND
AVDD
NC
NC
VREF
GND
AVDD
GND
CLK
CLK
GND
AVDD
AVDD
GND
AIN
AIN
GND
AVDD
GND
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DEVICE INFORMATION
PFP PACKAGE
(TOP VIEW)
P0027-01
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DEVICE INFORMATION (continued)
TERMINAL FUNCTIONS
TERMINAL
NAME
DESCRIPTION
NO.
3, 8, 13, 14, 19, 21,
23, 25, 27, 31, 35, 37, Analog power supply
39
AVDD
DVDD
1, 51, 66
Output driver power supply
2, 7, 9, 12, 15, 18, 20,
22, 24, 26, 28, 30, 32, Ground
34, 36, 38, 40, 52, 65
GND
VREF
6
Reference voltage
CLK
10
Differential input clock (positive). Conversion initiated on rising edge.
CLK
11
Differential input clock (negative)
AIN
16
Differential input signal (positive)
AIN
17
Differential input signal (negative)
OVR, OVR
42, 41
Over range indicator LVDS output. A logic high signals an analog input in excess of the
full-scale range.
D0, D0
50, 49
LVDS digital output pair, least-significant bit (LSB)
D1–D6, D1–D6
53–64
LVDS digital output pairs
D7–D11, D7–D11
67–76
LVDS digital output pairs
D12, D12
78, 77
LVDS digital output pair, most-significant bit (MSB)
DRY, DRY
80, 79
Data ready LVDS output pair
NC
4, 5, 29, 33, 43–48
No connect
DEFINITION OF SPECIFICATIONS
Analog Bandwidth The analog input frequency at which the power of the fundamental is reduced by 3 dB with respect to the
low frequency value.
Aperture Delay The delay in time between the rising edge of the input sampling clock and the actual time at which the
sampling occurs.
Aperture Uncertainty (Jitter) The sample-to-sample variation in aperture delay.
Clock Pulse Width/Duty Cycle The duty cycle of a clock signal is the ratio of the time the clock signal remains at a logic
high (clock pulse width) to the period of the clock signal. Duty cycle is typically expressed as a percentage. A
perfect differential sine wave clock results in a 50% duty cycle.
Maximum Conversion Rate The maximum sampling rate at which certified operation is given. All parametric testing is
performed at this sampling rate unless otherwise noted.
Minimum Conversion Rate The minimum sampling rate at which the ADC functions.
Differential Nonlinearity (DNL) An ideal ADC exhibits code transitions at analog input values spaced exactly 1 LSB apart.
The DNL is the deviation of any single step from this ideal value, measured in units of LSB.
Integral Nonlinearity (INL) The INL is the deviation of the ADCs transfer function from a best fit line determined by a least
squares curve fit of that transfer function. The INL at each analog input value is the difference between the
actual transfer function and this best fit line, measured in units of LSB.
Gain Error
The gain error is the deviation of the ADCs actual input full-scale range from its ideal value. The gain error is
given as a percentage of the ideal input full-scale range.
Offset Error
Offset error is the deviation of output code from mid-code when both inputs are tied to common-mode.
Temperature Drift Temperature drift (with respect to gain error and offset error) specifies the change from the value at the
nominal temperature to the value at TMIN or TMAX. It is computed as the maximum variation the parameters
over the whole temperature range divided by TMIN – TMAX.
Signal-to-Noise Ratio (SNR) SNR is the ratio of the power of the fundamental (PS) to the noise floor power (PN), excluding
the power at dc and the first five harmonics.
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DEFINITION OF SPECIFICATIONS (continued)
SNR + 10log
P
S
10 P
N
(1)
SNR is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the
reference, or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s
full-scale range.
Signal-to-Noise and Distortion (SINAD) SINAD is the ratio of the power of the fundamental (PS) to the power of all the
other spectral components including noise (PN) and distortion (PD), but excluding dc.
P
SINAD + 10log
S
10 P ) P
N
D
(2)
SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as
the reference, or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s
full-scale range.
Effective Resolution Bandwidth The highest input frequency where the SNR (dB) is dropped by 3 dB for a full-scale input
amplitude.
Total Harmonic Distortion (THD) THD is the ratio of the power of the fundamental (PS) to the power of the first five
harmonics (PD).
P
THD + 10log
10 P
S
D
(3)
THD is typically given in units of dBc (dB to carrier).
Two-Tone Intermodulation Distortion IMD3 is the ratio of the power of the fundamental (at frequencies f1, f2) to the power
of the worst spectral component at either frequency 2f1– f2 or 2f2– f1). IMD3 is either given in units of dBc (dB
to carrier) when the absolute power of the fundamental is used as the reference or dBFS (dB to full scale)
when the power of the fundamental is extrapolated to the converter’s full-scale range.
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TYPICAL CHARACTERISTICS
Spectral Performance
(FFT For 10 MHz Input Signal)
Spectral Performance
(FFT For 100 MHz Input Signal)
0
0
SFDR = 86.8 dBc
SNR = 68.7 dBc
THD = 82.3 dBc
SINAD = 68.5 dBc
−20
−40
Amplitude − dB
Amplitude − dB
−20
SFDR = 76.1 dBc
SNR = 69 dBc
THD = 72.6 dBc
SINAD = 67.4 dBc
−60
−80
−100
−40
−60
−80
−100
−120
−120
0
10 20 30 40 50 60 70 80 90 100 110 120
0
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G001
G002
Figure 3.
Figure 4.
Spectral Performance
(FFT For 170 MHz Input Signal)
Spectral Performance
(FFT For 230 MHz Input Signal)
0
0
SFDR = 74.6 dBc
SNR = 68.4 dBc
THD = 72.5 dBc
SINAD = 67 dBc
−20
−40
Amplitude − dB
Amplitude − dB
−20
SFDR = 77 dBc
SNR = 67.3 dBc
THD = 75.6 dBc
SINAD = 66.7 dBc
−60
−80
−40
−60
−80
−100
−100
−120
−120
0
0
10 20 30 40 50 60 70 80 90 100 110 120
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G004
G003
Figure 5.
12
Figure 6.
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TYPICAL CHARACTERISTICS (continued)
Spectral Performance
(FFT For 300 MHz Input Signal)
Spectral Performance
(FFT For 400 MHz Input Signal)
0
0
SFDR = 70.2 dBc
SNR = 67 dBc
THD = 69.5 dBc
SINAD = 65 dBc
−20
−40
Amplitude − dB
Amplitude − dB
−20
SFDR = 62.5 dBc
SNR = 66.2 dBc
THD = 61.8 dBc
SINAD = 60.4 dBc
−60
−80
−100
−40
−60
−80
−100
−120
−120
0
10 20 30 40 50 60 70 80 90 100 110 120
0
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G005
G006
Figure 7.
Figure 8.
Two-Tone Intermodulation Distortion
(FFT For 51.5 MHz and 52.5 MHz Input Signals)
Two-Tone Intermodulation Distortion
(FFT For 51.5 MHz and 52.5 MHz Input Signals)
0
0
FIN1 = 51.5 MHz, −7 dBFS
FIN2 = 52.5 MHz, −7 dBFS
IMD3 = 100.6 dBFS
−20
−40
Amplitude − dB
Amplitude − dB
−20
FIN1 = 51.5 MHz, −16 dBFS
FIN2 = 52.5 MHz, −16 dBFS
IMD3 = 99.6 dBFS
−60
−80
−100
−40
−60
−80
−100
−120
−120
0
10 20 30 40 50 60 70 80 90 100 110 120
0
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G007
Figure 9.
G008
Figure 10.
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TYPICAL CHARACTERISTICS (continued)
Two-Tone Intermodulation Distortion
(FFT For 151 MHz and 152 MHz Input Signals)
Two-Tone Intermodulation Distortion
(FFT For 151 MHz and 152 MHz Input Signals)
0
0
FIN1 = 151 MHz, −7 dBFS
FIN2 = 152 MHz, −7 dBFS
IMD3 = 89.4 dBFS
−20
−40
Amplitude − dB
Amplitude − dB
−20
FIN1 = 151 MHz, −16 dBFS
FIN2 = 152 MHz, −16 dBFS
IMD3 = 92.5 dBFS
−60
−80
−100
−40
−60
−80
−100
−120
−120
0
10 20 30 40 50 60 70 80 90 100 110 120
0
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G009
G010
Figure 11.
Figure 12.
Two-Tone Intermodulation Distortion
(FFT For 229 MHz and 230 MHz Input Signals)
Two-Tone Intermodulation Distortion
(FFT For 229 MHz and 230 MHz Input Signals)
0
0
FIN1 = 229 MHz, −7 dBFS
FIN2 = 230 MHz, −7 dBFS
IMD3 = 85.8 dBFS
−20
−40
Amplitude − dB
Amplitude − dB
−20
FIN1 = 229 MHz, −16 dBFS
FIN2 = 230 MHz, −16 dBFS
IMD3 = 101.4 dBFS
−60
−80
−100
−40
−60
−80
−100
−120
−120
0
10 20 30 40 50 60 70 80 90 100 110 120
0
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G011
Figure 13.
14
G012
Figure 14.
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TYPICAL CHARACTERISTICS (continued)
Two-Tone Intermodulation Distortion
(FFT For 300 MHz and 301 MHz Input Signals)
Two-Tone Intermodulation Distortion
(FFT For 300 MHz and 301 MHz Input Signals)
0
0
FIN1 = 300 MHz, −7 dBFS
FIN2 = 301 MHz, −7 dBFS
IMD3 = 83.3 dBFS
−20
−40
Amplitude − dB
Amplitude − dB
−20
FIN1 = 300 MHz, −16 dBFS
FIN2 = 301 MHz, −16 dBFS
IMD3 = 101.9 dBFS
−60
−80
−100
−40
−60
−80
−100
−120
−120
0
10 20 30 40 50 60 70 80 90 100 110 120
0
10 20 30 40 50 60 70 80 90 100 110 120
Frequency − MHz
Frequency − MHz
G013
G014
Figure 15.
Figure 16.
Input Bandwidth
Differential Nonlinearity
1
0.4
fS = 250 MSPS
fIN = 10 MHz
0
Differential Nonlinearity − LSB
−1
Input Amplitude − dB
−2
−3
−4
−5
−6
−7
−8
fS = 250 MSPS
AIN = −1 dBFS
−9
−10
1
0.2
0.0
−0.2
−0.4
10
100
fIN − Input Frequency − MHz
1k
50
1050 2050 3050 4050 5050 6050 7050 8050
Code
G017
Figure 17.
G018
Figure 18.
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TYPICAL CHARACTERISTICS (continued)
Integral Nonlinearity
Noise Histogram With Inputs Shorted
2.0
50
45
fS = 250 MSPS
40
1.0
35
Percentage − %
INL − Integral Nonlinearity − LSB
1.5
0.5
0.0
−0.5
30
25
20
15
−1.0
10
−1.5
fS = 250 MSPS
fIN = 10 MHz
−2.0
0
5
0
1000 2000 3000 4000 5000 6000 7000 8000
4109 4110 4111 4112 4113 4114 4115 4116
Code
Code Number
G019
G020
Figure 19.
Figure 20.
AC Performance
vs
Input Amplitude
AC Performance
vs
Input Amplitude
120
120
SFDR (dBFS)
SFDR (dBFS)
100
80
SNR (dBFS)
Performance − dB
Performance − dB
80
100
60
40
SFDR (dBc)
20
SNR (dBFS)
60
40
SFDR (dBc)
20
SNR (dBc)
SNR (dBc)
0
0
−20
−20
fS = 250 MSPS
fIN = 100 MHz
−40
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10
fS = 250 MSPS
fIN = 230 MHz
−40
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10
0
Input Amplitude − dBFS
G021
Figure 21.
16
0
Input Amplitude − dBFS
G022
Figure 22.
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TYPICAL CHARACTERISTICS (continued)
Two-Tone Spurious Free Dynamic Range
vs
Input Amplitude
Spurious Free Dynamic Range
vs
Clock Duty Cycle
80.0
SFDR − Spurious-Free Dynamic Range − dBc
SFDR − Spurious-Free Dynamic Range − dB
120
SFDR (dBFS)
100
80
60
SFDR (dBc)
40
90 dBFS Line
20
0
fS = 250 MSPS
fIN = 100 MHz
−20
−110−100 −90 −80 −70 −60 −50 −40 −30 −20 −10
fS = 250 MSPS
77.5
75.0
fIN = 230 MHz
72.5
70.0
67.5
fIN = 100 MHz
65.0
62.5
60.0
0
0
20
40
Input Amplitude − dBFS
60
80
100
Duty Cycle − %
G024
Figure 23.
Figure 24.
Spurious Free Dynamic Range
vs
Clock Level
Signal-to-Noise Ratio
vs
Clock Level
78
70
76
69
fIN = 230 MHz
SNR − Signal-to-Noise Ratio − dBc
SFDR − Spurious-Free Dynamic Range − dBc
G023
74
72
fIN = 100 MHz
70
68
66
64
62
fIN = 100 MHz
68
67
fIN = 230 MHz
66
65
64
63
62
61
fS = 250 MSPS
fS = 250 MSPS
60
0.0
0.5
1.0
1.5
2.0
2.5
3.0
Clock Amplitude − VP−P
3.5
4.0
60
0.0
0.5
1.0
1.5
2.0
2.5
3.0
Clock Amplitude − VP−P
G025
Figure 25.
3.5
4.0
G026
Figure 26.
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TYPICAL CHARACTERISTICS (continued)
Performance
vs
Clock Common Mode Level
Spurious Free Dynamic Range
vs
AVDD Across Temperature
80
74
SFDR − Spurious-Free Dynamic Range − dBc
fS = 250 MSPS
75
Performance − dBc
SFDR
70
SNR
65
60
55
50
0
1
2
3
4
TA = 65°C
73
TA = −40°C
72
TA = 25°C
71
70
TA = 0°C
69
fS = 250 MSPS
fIN = 100 MHz
68
4.65
5
Clock Common-Mode Voltage − V
4.85
4.95
5.05
5.15
5.25
5.35
G028
Figure 27.
Figure 28.
Signal-to-Noise Ratio
vs
AVDD Across Temperature
Spurious Free Dynamic Range
vs
DRVDD Across Temperature
72.5
70.0
SFDR − Spurious-Free Dynamic Range − dBc
fS = 250 MSPS
fIN = 100 MHz
SNR − Signal-to-Noise Ratio − dBc
4.75
AVDD − Supply Voltage − V
G027
69.5
69.0
TA = 65°C
68.5
TA = −40°C
TA = 0°C
68.0
TA = 25°C
TA = 85°C
67.5
67.0
4.65
4.75
4.85
4.95
5.05
5.15
AVDD − Supply Voltage − V
5.25
5.35
TA = −40°C
72.0
71.5
TA = 25°C
71.0
70.5
TA = 0°C
70.0
69.5
69.0
2.9
fS = 250 MSPS
fIN = 100 MHz
3.1
TA = 65°C
TA = 85°C
3.3
3.5
DRVDD − Supply Voltage − V
G029
Figure 29.
18
TA = 85°C
Figure 30.
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G030
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TYPICAL CHARACTERISTICS (continued)
Signal-to-Noise Ratio
vs
DRVDD Across Temperature
69.0
SNR − Signal-to-Noise Ratio − dBc
TA = 25°C
TA = 65°C
68.9
fS = 250 MSPS
fIN = 100 MHz
68.8
68.7
TA = 85°C
TA = 0°C
68.6
68.5
TA = −40°C
68.4
2.9
3.0
3.1
3.2
3.3
3.4
3.5
3.6
DRVDD − Supply Voltage − V
3.7
G031
Figure 31.
SNR
vs
Input Frequency and Sampling Frequency
300
fS - Sampling Frequency - MHz
250
200
69.5
69
150
68.5
68
67.5
67
100
66.5
66
65.5
50
50
150
100
200
250
300
350
400
fIN - Input Frequency - MHz
63
64
65
66
SNR - dBc
67
68
69
M0048-05
Figure 32.
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TYPICAL CHARACTERISTICS (continued)
SFDR
vs
Input Frequency and Sampling Frequency
68
300
68
fS - Sampling Frequency - MHz
250
65
80
74
71
71
68
74
83
77
77
86
200
80
80
89
150
68
77
83
74
83
71
86
83
89
86
100
50
77
80
68
89
74
50
150
100
200
250
300
71
350
400
fIN - Input Frequency - MHz
65
70
75
SFDR - dBc
Figure 33.
20
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85
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APPLICATION INFORMATION
Theory of Operation
The ADS5444 is a 13-bit, 250-MSPS, monolithic pipeline analog-to-digital converter (ADC). Its bipolar analog
core operates from a 5 V supply, while the output uses a 3.3-V supply to provide LVDS compatible outputs. The
conversion process is initiated by the rising edge of the external input clock. At that instant, the differential input
signal is captured by the input track and hold (T&H) and the input sample is sequentially converted by a series
of small resolution stages, with the outputs combined in a digital correction logic block. Both the rising and the
falling clock edges are used to propagate the sample through the pipeline every half clock cycle. This process
results in a data latency of four clock cycles, after which the output data is available as a 13-bit parallel word,
coded in offset binary format.
Input Configuration
The analog input for the ADS5444 consists of an analog differential buffer followed by a bipolar T&H. The
analog buffer isolates the source driving the input of the ADC from any internal switching. The input common
mode is set internally through a 500-Ω resistor connected from 2.4 V to each of the inputs. This results in a
differential input impedance of 1 kΩ.
For a full-scale differential input, each of the differential lines of the input signal (pins 16 and 17) swings
symmetrically between 2.4 + 0.55 V and 2.4 – 0.55 V. This means that each input has a maximum signal swing
of 1.1 VPP for a total differential input signal swing of 2.2 VPP. The maximum swing is determined by the internal
reference voltage generator eliminating the need for any external circuitry for this purpose.
The ADS5444 obtains optimum performance when the analog inputs are driven differentially. The circuit in
Figure 34 shows one possible configuration using an RF transformer with termination either on the primary or on
the secondary of the transformer. If voltage gain is required, a step up transformer can be used. For voltage
gains that would require an impractical transformer turn ratio, a single-ended amplifier driving the transformer is
shown in Figure 35).
Z0
50 W
R0
50 W
AIN
1:1
R
50 W
AC Signal
Source
ADS5444
AIN
ADT1-1WT
Figure 34. Converting a Single-Ended Input to a Differential Signal Using RF Transformers
5V
VIN
−5 V
RS
100 Ω
+
OPA695
−
0.1 µF
1000 µF
RIN
1:1
RT
100 Ω
RIN
AIN
CIN
ADS5444
AIN
R1
400 Ω
R2
57.5 Ω
AV = 8V/V
(18 dB)
Figure 35. Using the OPA695 With the ADS5444
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Application Information (continued)
From VIN
50 Ω
Source
100 Ω
78.9 Ω
348 Ω
13-Bit
250 MSPS
+5V
49.9 Ω
0.22 µF
100 Ω
THS4509
49.9 Ω
18 pF
AIN
ADS5444
AIN
CM
49.9 Ω
0.22 µF
78.9 Ω
VREF
49.9 Ω
0.22 µF
348 Ω
0.1 µF
0.1 µF
Figure 36. Using the THS4509 With the ADS5444
Besides the OPA695, TI offers a wide selection of single-ended operational amplifiers that can be selected
depending on the application. An RF gain block amplifier, such as the TI THS9001, can also be used with an RF
transformer for high input frequency applications. For applications requiring dc-coupling with the signal source, a
differential input/differential output amplifier like the THS4509 (see Figure 36) is a good solution, as it minimizes
board space and reduces the number of components.
In this configuration, the THS4509 amplifier circuit provides 10 dB of gain, converts the single-ended input to
differential, and sets the proper input common-mode voltage to the ADS5444.
The 50-Ω resistors and 18-pF capacitor between the THS4509 outputs and ADS5444 inputs (along with the
input capacitance of the ADC) limit the bandwidth of the signal to about 70 MHz (–3 dB).
Input termination is accomplished via the 78.9-Ω resistor and 0.22-µF capacitor to ground in conjunction with the
input impedance of the amplifier circuit. A 0.22-µF capacitor and 49.9-Ω resistor is inserted to ground across the
78.9-Ω resistor and 0.22-µF capacitor on the alternate input to balance the circuit.
Gain is a function of the source impedance, termination, and 348-Ω feedback resistor. See the THS4509 data
sheet for further component values to set proper 50-Ω termination for other common gains.
Since the ADS5444 recommended input common-mode voltage is 2.4 V, the THS4509 is operated from a single
power supply input with VS+ = 5 V and VS– = 0 V (ground). This maintains maximum headroom on the internal
transistors of the THS4509.
Clock Inputs
The ADS5444 clock input can be driven with either a differential clock signal or a single-ended clock input, with
little or no difference in performance between both configurations. In low input frequency applications, where
jitter may not be a big concern, the use of single-ended clock (see Figure 37) could save some cost and board
space without any trade-off in performance. When driven on this configuration, it is best to connect CLK to
ground with a 0.01 µF capacitor, while CLK is ac-coupled with a 0.01-µF capacitor to the clock source, as shown
in Figure 37.
Square Wave or
Sine Wave
CLK
0.01 µF
ADS5444
CLK
0.01 µF
Figure 37. Single-Ended Clock
22
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Application Information (continued)
0.1 µF
Clock
Source
1:4
CLK
MA3X71600LCT−ND
ADS5444
CLK
Figure 38. Differential Clock
For jitter-sensitive applications, the use of a differential clock has some advantages (as with any other ADC) at
the system level. The first advantage is that it allows for common-mode noise rejection at the PCB level.
A differential clock also allows for the use of bigger clock amplitudes without exceeding the absolute maximum
ratings. In the case of a sinusoidal clock, this results in higher slew rates and reduces the impact of clock noise
on jitter. See Clocking High Speed Data Converters (SLYT075) for more details.
Figure 38 shows this approach. The back-to-back Schottky diodes can be added to limit the clock amplitude in
cases where this would exceed the absolute maximum ratings, even when using a differential clock.
100 nF
MC100EP16DT
100 nF
D
D
CLK
Q
VBB Q
499 W
100 nF
100 nF
ADS5444
CLK
499 W
50 Ω
50 Ω
100 nF
113 Ω
Figure 39. Differential Clock Using PECL Logic
Another possibility is the use of a logic based clock, such as PECL. In this case, the slew rate of the edges will
most likely be much higher than the one obtained for the same clock amplitude based on a sinusoidal clock.
This solution would minimize the effect of the slope dependent ADC jitter. Using logic gates to square a
sinusoidal clock may not produce the best results as logic gates may not have been optimized to act as
comparators, adding too much jitter while squaring the inputs.
The common-mode voltage of the clock inputs is set internally to 2.4 V using internal 1-kΩ resistors. It is
recommended to use ac coupling, but if this scheme is not possible due to, for instance, asynchronous clocking,
the ADS5444 features good tolerance to clock common-mode variation.
Additionally, the internal ADC core uses both edges of the clock for the conversion process. Ideally, a 50% duty
cycle clock signal should be provided.
Digital Outputs
The ADC provides 13 data outputs (D12 to D0, with D12 being the MSB and D0 the LSB), a data-ready signal
(DRY), and an over-range indicator (OVR) that equals a logic high when the output reaches the full-scale limits.
The output format is offset binary. It is recommended to use the DRY signal to capture the output data of the
ADS5444.
The ADS5444 digital outputs are LVDS compatible.
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Application Information (continued)
Power Supplies
The use of low noise power supplies with adequate decoupling is recommended. Linear supplies are the
preferred choice versus switched ones, which tend to generate more noise components that can be coupled to
the ADS5444.
The ADS5444 uses two power supplies. For the analog portion of the design, a 5-V AVDD is used, while for the
digital outputs supply (DRVDD) we recommend the use of 3.3 V. All the ground pins are marked as GND,
although AGND pins and DRGND pins are not tied together inside the package.
Layout Information
The evaluation board represents a good guideline of how to layout the board to obtain the maximum
performance out of the ADS5444. General design rules as the use of multilayer boards, single ground plane for
ADC ground connections and local decoupling ceramic chip capacitors should be applied. The input traces
should be isolated from any external source of interference or noise including the digital outputs, as well as the
clock traces. The clock signal traces should also be isolated from other signals, especially in applications where
low jitter is required as high IF sampling.
Besides performance oriented rules, care has to be taken when considering the heat dissipation out of the
device. The thermal heatsink should be soldered to the board as described in the PowerPad Package section.
PowerPAD Package
The PowerPAD package is a thermally-enhanced standard size IC package designed to eliminate the use of
bulky heatsinks and slugs traditionally used in thermal packages. This package can be easily mounted using
standard printed circuit board (PCB) assembly techniques, and can be removed and replaced using standard
repair procedures.
The PowerPAD package is designed so that the leadframe die pad (or thermal pad) is exposed on the bottom of
the IC. This provides an extremely low thermal resistance path between the die and the exterior of the package.
The thermal pad on the bottom of the IC can then be soldered directly to the PCB using the PCB as a heatsink.
Assembly Process
1. Prepare the PCB top-side etch pattern including etch for the leads, as well as the thermal pad as illustrated
in the Mechanical Data section.
2. Place a 6-by-6 array of thermal vias in the thermal pad area. These holes should be 13 mils in diameter.
The small size prevents wicking of the solder through the holes.
3. It is recommended to place a small number of 25-mil diameter holes under the package, but outside the
thermal pad area to provide an additional heat path.
4. Connect all holes (both those inside and outside the thermal pad area) to an internal copper plane (such as
a ground plane).
5. Do not use the typical web or spoke via connection pattern when connecting the thermal vias to the ground
plane. The spoke pattern increases the thermal resistance to the ground plane.
6. The top-side solder mask should leave exposed the terminals of the package and the thermal pad area.
7. Cover the entire bottom side of the PowerPAD vias to prevent solder wicking.
8. Apply solder paste to the exposed thermal pad area and all of the package terminals.
For more detailed information regarding the PowerPAD package and its thermal properties, see either the
SLMA004 application brief, PowerPAD Made Easy, or the technical brief, PowerPAD Thermally Enhanced
Package (SLMA002).
24
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11-Apr-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
(2)
MSL Peak Temp
Op Temp (°C)
Top-Side Markings
(3)
(4)
ADS5444MPFPEP
ACTIVE
HTQFP
PFP
80
96
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-55 to 125
ADS5444M-EP
V62/06668-01XE
ACTIVE
HTQFP
PFP
80
96
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-55 to 125
ADS5444M-EP
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a
continuation of the previous line and the two combined represent the entire Top-Side Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF ADS5444-EP :
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
11-Apr-2013
• Catalog: ADS5444
• Space: ADS5444-SP
NOTE: Qualified Version Definitions:
• Catalog - TI's standard catalog product
• Space - Radiation tolerant, ceramic packaging and qualified for use in Space-based application
Addendum-Page 2
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Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
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Copyright © 2016, Texas Instruments Incorporated
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